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Sample records for energy focused ion

  1. Ion focusing

    DOEpatents

    Cooks, Robert Graham; Baird, Zane; Peng, Wen-Ping

    2015-11-10

    The invention generally relates to apparatuses for focusing ions at or above ambient pressure and methods of use thereof. In certain embodiments, the invention provides an apparatus for focusing ions that includes an electrode having a cavity, at least one inlet within the electrode configured to operatively couple with an ionization source, such that discharge generated by the ionization source is injected into the cavity of the electrode, and an outlet. The cavity in the electrode is shaped such that upon application of voltage to the electrode, ions within the cavity are focused and directed to the outlet, which is positioned such that a proximal end of the outlet receives the focused ions and a distal end of the outlet is open to ambient pressure.

  2. Ion energy distribution near a plasma meniscus with beam extraction for multi element focused ion beams

    SciTech Connect

    Mathew, Jose V.; Paul, Samit; Bhattacharjee, Sudeep

    2010-05-15

    An earlier study of the axial ion energy distribution in the extraction region (plasma meniscus) of a compact microwave plasma ion source showed that the axial ion energy spread near the meniscus is small ({approx}5 eV) and comparable to that of a liquid metal ion source, making it a promising candidate for focused ion beam (FIB) applications [J. V. Mathew and S. Bhattacharjee, J. Appl. Phys. 105, 96101 (2009)]. In the present work we have investigated the radial ion energy distribution (IED) under the influence of beam extraction. Initially a single Einzel lens system has been used for beam extraction with potentials up to -6 kV for obtaining parallel beams. In situ measurements of IED with extraction voltages upto -5 kV indicates that beam extraction has a weak influence on the energy spread ({+-}0.5 eV) which is of significance from the point of view of FIB applications. It is found that by reducing the geometrical acceptance angle at the ion energy analyzer probe, close to unidirectional distribution can be obtained with a spread that is smaller by at least 1 eV.

  3. Energy spectrum of argon ions emitted from Filippov type Sahand plasma focus.

    PubMed

    Mohammadnejad, M; Pestehe, S J; Mohammadi, M A

    2013-07-01

    The energy and flux of the argon ions produced in Sahand plasma focus have been measured by employing a well-designed Faraday cup. The secondary electron emission effects on the ion signals are simulated and the dimensions of Faraday cup are optimized to minimize these effects. The measured ion energy spectrum is corrected for the ion energy loss and charge exchange in the background gas. The effects of the capacitor bank voltage and working gas pressure on the ion energy spectrum are also investigated. It has been shown that the emitted ion number per energy increases as the capacitor bank voltage increases. Decreasing the working gas pressure leads to the increase in the number of emitted ion per energy. PMID:23902061

  4. Energy spectrum of argon ions emitted from Filippov type Sahand plasma focus

    SciTech Connect

    Mohammadnejad, M.; Pestehe, S. J.; Mohammadi, M. A.

    2013-07-15

    The energy and flux of the argon ions produced in Sahand plasma focus have been measured by employing a well-designed Faraday cup. The secondary electron emission effects on the ion signals are simulated and the dimensions of Faraday cup are optimized to minimize these effects. The measured ion energy spectrum is corrected for the ion energy loss and charge exchange in the background gas. The effects of the capacitor bank voltage and working gas pressure on the ion energy spectrum are also investigated. It has been shown that the emitted ion number per energy increases as the capacitor bank voltage increases. Decreasing the working gas pressure leads to the increase in the number of emitted ion per energy.

  5. Energy spectrum of argon ions emitted from Filippov type Sahand plasma focus

    NASA Astrophysics Data System (ADS)

    Mohammadnejad, M.; Pestehe, S. J.; Mohammadi, M. A.

    2013-07-01

    The energy and flux of the argon ions produced in Sahand plasma focus have been measured by employing a well-designed Faraday cup. The secondary electron emission effects on the ion signals are simulated and the dimensions of Faraday cup are optimized to minimize these effects. The measured ion energy spectrum is corrected for the ion energy loss and charge exchange in the background gas. The effects of the capacitor bank voltage and working gas pressure on the ion energy spectrum are also investigated. It has been shown that the emitted ion number per energy increases as the capacitor bank voltage increases. Decreasing the working gas pressure leads to the increase in the number of emitted ion per energy.

  6. Fabrication of a TEM sample of ion-irradiated material using focused ion beam microprocessing and low-energy Ar ion milling.

    PubMed

    Jin, Hyung-Ha; Shin, Chansun; Kwon, Junhyun

    2010-01-01

    Cross-section-view TEM samples of ion-irradiated material are successfully fabricated using a focused ion beam (FIB) system and low-energy Ar ion milling. Ga ion-induced damages in FIB processing are reduced remarkably by the means of low-energy Ar ion milling. There are optimized ion milling conditions for the reduction and removal of the secondary artifacts such as defects and ripples. Incident angles and accelerated voltages are especially more important factors on the preservation of a clean surface far from secondary defects and surface roughing due to Ga and Ar ion bombardment.

  7. Focusing dynamics of high-energy density, laser-driven ion beams.

    PubMed

    Chen, S N; d'Humières, E; Lefebvre, E; Romagnani, L; Toncian, T; Antici, P; Audebert, P; Brambrink, E; Cecchetti, C A; Kudyakov, T; Pipahl, A; Sentoku, Y; Borghesi, M; Willi, O; Fuchs, J

    2012-02-01

    The dynamics of the focusing of laser-driven ion beams produced from concave solid targets was studied. Most of the ion beam energy is observed to converge at the center of the cylindrical targets with a spot diameter of 30  μm, which can be very beneficial for applications requiring high beam energy densities. Also, unbalanced laser irradiation does not compromise the focusability of the beam. However, significant filamentation occurs during the focusing, potentially limiting the localization of the energy deposition region by these beams at focus. These effects could impact the applicability of such high-energy density beams for applications, e.g., in proton-driven fast ignition. PMID:22400936

  8. Focused ion beam system

    DOEpatents

    Leung, Ka-Ngo; Gough, Richard A.; Ji, Qing; Lee, Yung-Hee Yvette

    1999-01-01

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 .mu.m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 .mu.m or less.

  9. Focused ion beam system

    DOEpatents

    Leung, K.; Gough, R.A.; Ji, Q.; Lee, Y.Y.

    1999-08-31

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 {mu}m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 m or less. 13 figs.

  10. Collective Focusing of Intense Ion Beam Pulses for High-energy Density Physics Applications

    SciTech Connect

    Dorf, Mikhail A.; Kaganovich, Igor D.; Startsev, Edward A.; Davidson, Ronald C.

    2011-04-27

    The collective focusing concept in which a weak magnetic lens provides strong focusing of an intense ion beam pulse carrying a neutralizing electron background is investigated by making use of advanced particle-in-cell simulations and reduced analytical models. The original analysis by Robertson Phys. Rev. Lett. 48, 149 (1982) is extended to the parameter regimes of particular importance for several high-energy density physics applications. The present paper investigates (1) the effects of non-neutral collective focusing in a moderately strong magnetic field; (2) the diamagnetic effects leading to suppression of the applied magnetic field due to the presence of the beam pulse; and (3) the influence of a finite-radius conducting wall surrounding the beam cross-section on beam neutralization. In addition, it is demonstrated that the use of the collective focusing lens can significantly simplify the technical realization of the final focusing of ion beam pulses in the Neutralized Drift Compression Experiment-I (NDCX-I) , and the conceptual designs of possible experiments on NDCX-I are investigated by making use of advanced numerical simulations. 2011 American Institute of Physics

  11. Collective focusing of intense ion beam pulses for high-energy density physics applications

    SciTech Connect

    Dorf, Mikhail A.; Kaganovich, Igor D.; Startsev, Edward A.; Davidson, Ronald C.

    2011-03-15

    The collective focusing concept in which a weak magnetic lens provides strong focusing of an intense ion beam pulse carrying a neutralizing electron background is investigated by making use of advanced particle-in-cell simulations and reduced analytical models. The original analysis by Robertson [Phys. Rev. Lett. 48, 149 (1982)] is extended to the parameter regimes of particular importance for several high-energy density physics applications. The present paper investigates (1) the effects of non-neutral collective focusing in a moderately strong magnetic field; (2) the diamagnetic effects leading to suppression of the applied magnetic field due to the presence of the beam pulse; and (3) the influence of a finite-radius conducting wall surrounding the beam cross-section on beam neutralization. In addition, it is demonstrated that the use of the collective focusing lens can significantly simplify the technical realization of the final focusing of ion beam pulses in the Neutralized Drift Compression Experiment-I (NDCX-I), and the conceptual designs of possible experiments on NDCX-I are investigated by making use of advanced numerical simulations.

  12. High current density ion beam obtained by a transition to a highly focused state in extremely low-energy region

    SciTech Connect

    Hirano, Y. E-mail: hirano.yoichi@phys.cst.nihon-u.ac.jp; Kiyama, S.; Koguchi, H.; Fujiwara, Y.; Sakakita, H.

    2015-11-15

    A high current density (≈3 mA/cm{sup 2}) hydrogen ion beam source operating in an extremely low-energy region (E{sub ib} ≈ 150–200 eV) has been realized by using a transition to a highly focused state, where the beam is extracted from the ion source chamber through three concave electrodes with nominal focal lengths of ≈350 mm. The transition occurs when the beam energy exceeds a threshold value between 145 and 170 eV. Low-level hysteresis is observed in the transition when E{sub ib} is being reduced. The radial profiles of the ion beam current density and the low temperature ion current density can be obtained separately using a Faraday cup with a grid in front. The measured profiles confirm that more than a half of the extracted beam ions reaches the target plate with a good focusing profile with a full width at half maximum of ≈3 cm. Estimation of the particle balances in beam ions, the slow ions, and the electrons indicates the possibility that the secondary electron emission from the target plate and electron impact ionization of hydrogen may play roles as particle sources in this extremely low-energy beam after the compensation of beam ion space charge.

  13. High current density ion beam obtained by a transition to a highly focused state in extremely low-energy region.

    PubMed

    Hirano, Y; Kiyama, S; Fujiwara, Y; Koguchi, H; Sakakita, H

    2015-11-01

    A high current density (≈3 mA/cm(2)) hydrogen ion beam source operating in an extremely low-energy region (E(ib) ≈ 150-200 eV) has been realized by using a transition to a highly focused state, where the beam is extracted from the ion source chamber through three concave electrodes with nominal focal lengths of ≈350 mm. The transition occurs when the beam energy exceeds a threshold value between 145 and 170 eV. Low-level hysteresis is observed in the transition when E(ib) is being reduced. The radial profiles of the ion beam current density and the low temperature ion current density can be obtained separately using a Faraday cup with a grid in front. The measured profiles confirm that more than a half of the extracted beam ions reaches the target plate with a good focusing profile with a full width at half maximum of ≈3 cm. Estimation of the particle balances in beam ions, the slow ions, and the electrons indicates the possibility that the secondary electron emission from the target plate and electron impact ionization of hydrogen may play roles as particle sources in this extremely low-energy beam after the compensation of beam ion space charge.

  14. Lateral damage in graphene carved by high energy focused gallium ion beams

    SciTech Connect

    Liao, Zhongquan; Zhang, Tao; Jordan, Rainer; Gall, Martin; Rosenkranz, Rüdiger; Dianat, Arezoo; Cuniberti, Gianaurelio; and others

    2015-07-06

    Raman mapping is performed to study the lateral damage in supported monolayer graphene carved by 30 keV focused Ga{sup +} beams. The evolution of the lateral damage is tracked based on the profiles of the intensity ratio between the D (1341 cm{sup −1}) and G (1582 cm{sup −1}) peaks (I{sub D}/I{sub G}) of the Raman spectra. The I{sub D}/I{sub G} profile clearly reveals the transition from stage 2 disorder into stage 1 disorder in graphene along the direction away from the carved area. The critical lateral damage distance spans from <1 μm up to more than 30 μm in the experiment, depending on the parameters used for carving the graphene. The wide damage in the lateral direction is attributed to the deleterious tail of unfocused ions in the ion beam probe. The study raises the attention on potential sample damage during direct patterning of graphene nanostructures using the focused ion beam technique. Minimizing the total carving time is recommended to mitigate the lateral damage.

  15. Lateral damage in graphene carved by high energy focused gallium ion beams

    NASA Astrophysics Data System (ADS)

    Liao, Zhongquan; Zhang, Tao; Gall, Martin; Dianat, Arezoo; Rosenkranz, Rüdiger; Jordan, Rainer; Cuniberti, Gianaurelio; Zschech, Ehrenfried

    2015-07-01

    Raman mapping is performed to study the lateral damage in supported monolayer graphene carved by 30 keV focused Ga+ beams. The evolution of the lateral damage is tracked based on the profiles of the intensity ratio between the D (1341 cm-1) and G (1582 cm-1) peaks (ID/IG) of the Raman spectra. The ID/IG profile clearly reveals the transition from stage 2 disorder into stage 1 disorder in graphene along the direction away from the carved area. The critical lateral damage distance spans from <1 μm up to more than 30 μm in the experiment, depending on the parameters used for carving the graphene. The wide damage in the lateral direction is attributed to the deleterious tail of unfocused ions in the ion beam probe. The study raises the attention on potential sample damage during direct patterning of graphene nanostructures using the focused ion beam technique. Minimizing the total carving time is recommended to mitigate the lateral damage.

  16. ACCELERATION OF LOW-ENERGY IONS AT PARALLEL SHOCKS WITH A FOCUSED TRANSPORT MODEL

    SciTech Connect

    Zuo, Pingbing; Zhang, Ming; Rassoul, Hamid K.

    2013-04-10

    We present a test particle simulation on the injection and acceleration of low-energy suprathermal particles by parallel shocks with a focused transport model. The focused transport equation contains all necessary physics of shock acceleration, but avoids the limitation of diffusive shock acceleration (DSA) that requires a small pitch angle anisotropy. This simulation verifies that the particles with speeds of a fraction of to a few times the shock speed can indeed be directly injected and accelerated into the DSA regime by parallel shocks. At higher energies starting from a few times the shock speed, the energy spectrum of accelerated particles is a power law with the same spectral index as the solution of standard DSA theory, although the particles are highly anisotropic in the upstream region. The intensity, however, is different from that predicted by DSA theory, indicating a different level of injection efficiency. It is found that the shock strength, the injection speed, and the intensity of an electric cross-shock potential (CSP) jump can affect the injection efficiency of the low-energy particles. A stronger shock has a higher injection efficiency. In addition, if the speed of injected particles is above a few times the shock speed, the produced power-law spectrum is consistent with the prediction of standard DSA theory in both its intensity and spectrum index with an injection efficiency of 1. CSP can increase the injection efficiency through direct particle reflection back upstream, but it has little effect on the energetic particle acceleration once the speed of injected particles is beyond a few times the shock speed. This test particle simulation proves that the focused transport theory is an extension of DSA theory with the capability of predicting the efficiency of particle injection.

  17. Focused Ion beam source method and Apparatus

    SciTech Connect

    Pellin, Michael J.; Lykke, Keith R.; Lill, Thorsten B.

    1998-08-17

    A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud of laser ablated particles having unique characteristics, and extracting and focusing a charged particle beam from the laser ablated cloud. The method is especially suited for producing focused ion beams for semiconductor device analysis and modification.

  18. Focused ion beam source method and apparatus

    DOEpatents

    Pellin, Michael J.; Lykke, Keith R.; Lill, Thorsten B.

    2000-01-01

    A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud of laser ablated particles having unique characteristics, and extracting and focusing a charged particle beam from the laser ablated cloud. The method is especially suited for producing focused ion beams for semiconductor device analysis and modification.

  19. Focused ion beams in biology.

    PubMed

    Narayan, Kedar; Subramaniam, Sriram

    2015-11-01

    A quiet revolution is under way in technologies used for nanoscale cellular imaging. Focused ion beams, previously restricted to the materials sciences and semiconductor fields, are rapidly becoming powerful tools for ultrastructural imaging of biological samples. Cell and tissue architecture, as preserved in plastic-embedded resin or in plunge-frozen form, can be investigated in three dimensions by scanning electron microscopy imaging of freshly created surfaces that result from the progressive removal of material using a focused ion beam. The focused ion beam can also be used as a sculpting tool to create specific specimen shapes such as lamellae or needles that can be analyzed further by transmission electron microscopy or by methods that probe chemical composition. Here we provide an in-depth primer to the application of focused ion beams in biology, including a guide to the practical aspects of using the technology, as well as selected examples of its contribution to the generation of new insights into subcellular architecture and mechanisms underlying host-pathogen interactions.

  20. Micron-focused ion beamlets

    NASA Astrophysics Data System (ADS)

    Chowdhury, Abhishek; Bhattacharjee, Sudeep

    2010-05-01

    A multiple beam electrode system (MBES) is used to provide focused ion beamlets of elements from a compact microwave plasma. In this study, a honeycomb patterned plasma electrode with micron size apertures for extracting ion beamlets is investigated. The performance of the MBES is evaluated with the help of two widely adopted and commercially available beam simulation tools, AXCEL-INP and SIMION, where the input parameters are obtained from our experiments. A simple theoretical model based upon electrostatic ray optics is employed to compare the results of the simulations. It is found that the results for the beam focal length agree reasonably well. Different geometries are used to optimize the beam spot size and a beam spot ˜5-10 μm is obtained. The multiple ion beamlets will be used to produce microfunctional surfaces on soft matter like polymers. Additionally, the experimental set-up and plans are presented in the light of above applications.

  1. Cold atomic beam ion source for focused ion beam applications

    SciTech Connect

    Knuffman, B.; Steele, A. V.; McClelland, J. J.

    2013-07-28

    We report measurements and modeling of an ion source that is based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam systems. Our measurements of total ion current as a function of ionization conditions support an analytical model that also predicts the cross-sectional current density and spatial distribution of ions created in the source. The model predicts a peak brightness of 2 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1} and an energy spread less than 0.34 eV. The model is also combined with Monte-Carlo simulations of the inter-ion Coulomb forces to show that the source can be operated at several picoamperes with a brightness above 1 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1}. We estimate that when combined with a conventional ion focusing column, an ion source with these properties could focus a 1 pA beam into a spot smaller than 1 nm. A total current greater than 5 nA was measured in a lower-brightness configuration of the ion source, demonstrating the possibility of a high current mode of operation.

  2. Prize for Industrial Applications of Physics Talk: Low energy spread Ion source for focused ion beam systems-Search for the holy grail

    NASA Astrophysics Data System (ADS)

    Ward, Bill

    2011-03-01

    In this talk I will cover my personal experiences as a serial entrepreneur and founder of a succession of focused ion beam companies (1). Ion Beam Technology, which developed a 200kv (FIB) direct ion implanter (2). Micrion, where the FIB found a market in circuit edit and mask repair, which eventually merged with FEI corporation. and (3). ALIS Corporation which develop the Orion system, the first commercially successful sub-nanometer helium ion microscope, that was ultimately acquired by Carl Zeiss corporation. I will share this adventure beginning with my experiences in the early days of ion beam implantation and e-beam lithography which lead up to the final breakthrough understanding of the mechanisms that govern the successful creation and operation of a single atom ion source.

  3. Self-focusing of a high current density ion beam extracted with concave electrodes in a low energy region around 150 eV

    SciTech Connect

    Hirano, Y.; Kiyama, S.; Koguchi, H.; Sakakita, H.

    2014-02-15

    Spontaneous self-focusing of ion beam with high current density (J{sub c} ∼ 2 mA/cm{sup 2}, I{sub b} ∼ 65 mA) in low energy region (∼150 eV) is observed in a hydrogen ion beam extracted from an ordinary bucket type ion source with three electrodes having concave shape (acceleration, deceleration, and grounded electrodes). The focusing appears abruptly in the beam energy region over ∼135–150 eV, and the J{sub c} jumps up from 0.7 to 2 mA/cm{sup 2}. Simultaneously a strong electron flow also appears in the beam region. The electron flow has almost the same current density. Probably these electrons compensate the ion space charge and suppress the beam divergence.

  4. ION BEAM FOCUSING MEANS FOR CALUTRON

    DOEpatents

    Backus, J.G.

    1959-06-01

    An ion beam focusing arrangement for calutrons is described. It provides a virtual focus of origin for the ion beam so that the ions may be withdrawn from an arc plasma of considerable width providing greater beam current and accuracy. (T.R.H.)

  5. Electron density profile measurements at a self-focusing ion beam with high current density and low energy extracted through concave electrodes

    SciTech Connect

    Fujiwara, Y. Nakamiya, A.; Sakakita, H.; Hirano, Y.; Kiyama, S.; Koguchi, H.

    2014-02-15

    The self-focusing phenomenon has been observed in a high current density and low energy ion beam. In order to study the mechanism of this phenomenon, a special designed double probe to measure the electron density and temperature is installed into the chamber where the high current density ion beam is injected. Electron density profile is successfully measured without the influence of the ion beam components. Estimated electron temperature and density are ∼0.9 eV and ∼8 × 10{sup 8} cm{sup −3} at the center of ion beam cross section, respectively. It was found that a large amount of electrons are spontaneously accumulated in the ion beam line in the case of self-forcing state.

  6. Focused electron and ion beam systems

    DOEpatents

    Leung, Ka-Ngo; Reijonen, Jani; Persaud, Arun; Ji, Qing; Jiang, Ximan

    2004-07-27

    An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.

  7. Development of mass spectrometry by high energy focused heavy ion beam: MeV SIMS with 8 MeV Cl7+ beam

    NASA Astrophysics Data System (ADS)

    Jeromel, Luka; Siketić, Zdravko; Ogrinc Potočnik, Nina; Vavpetič, Primož; Rupnik, Zdravko; Bučar, Klemen; Pelicon, Primož

    2014-08-01

    Particle induced X-ray emission (PIXE) at microprobe of Jožef Stefan Institute is used to measure two-dimensional quantitative elemental maps of biological tissue. To improve chemical and biological understanding of the processes in vivo, supplementary information about chemical bonding and/or molecular distributions could be obtained by heavy-ion induced molecular desorption and a corresponding mass spectroscopy with Time-Of-Flight (TOF) mass spectrometer. As the method combines the use of heavy focused ions in MeV energy range and TOF Secondary Ion Mass Spectrometry, it is denoted as MeV SIMS. At Jožef Stefan Institute, we constructed a linear TOF spectrometer and mount it to our multipurpose nuclear microprobe. A beam of 8 MeV 35Cl7+ could be focused to a diameter of better than 3 μm × 3 μm and pulsed by electrostatic deflection at the high-energy side of accelerator. TOF mass spectrometer incorporates an 1 m long drift tube and a double stack microchannel plate (MCP) as a stop detector positioned at the end of the drift path. Secondary ions are focused at MCP using electrostatic cylindrical einzel lens. Time of flight spectra are currently acquired with a single-hit time-to-digital converter. Pulsed ion beam produces a shower of secondary ions that are ejected from positively biased target and accelerated towards MCP. We start our time measurement simultaneously with the start of the beam pulse. Signal of the first ion hitting MCP is used to stop the time measurement. Standard pulses proportional to the time of flight are produced with time to analog converter (TAC) and fed into analog-to-digital converter to obtain a time histogram. To enable efficient detection of desorbed fragments with higher molecular masses, which are of particular interest, we recently implemented a state-of art Field Programmable Gate Array (FPGA)-based multi-hit TOF acquisition. To test the system we used focused 8 MeV 35Cl7+ ion beam with pulse length of 180 ns. Mass resolution

  8. Ion heating in a plasma focus

    NASA Technical Reports Server (NTRS)

    Hohl, F.; Gary, S. P.

    1974-01-01

    Ion acceleration and heating in a plasma focus were investigated by the numerical integration of the three-dimensional equations of motion. The electric and magnetic fields given were derived from experimental data. The results obtained show that during the collapse phase of focus formation, ions are efficiently heated to temperatures of several keV. During the phase of rapid current reduction, ions are accelerated to large velocities in the axial direction. The results obtained with the model are in general agreement with experimental results.

  9. Monte Carlo simulations of nanoscale focused neon ion beam sputtering.

    PubMed

    Timilsina, Rajendra; Rack, Philip D

    2013-12-13

    A Monte Carlo simulation is developed to model the physical sputtering of aluminum and tungsten emulating nanoscale focused helium and neon ion beam etching from the gas field ion microscope. Neon beams with different beam energies (0.5-30 keV) and a constant beam diameter (Gaussian with full-width-at-half-maximum of 1 nm) were simulated to elucidate the nanostructure evolution during the physical sputtering of nanoscale high aspect ratio features. The aspect ratio and sputter yield vary with the ion species and beam energy for a constant beam diameter and are related to the distribution of the nuclear energy loss. Neon ions have a larger sputter yield than the helium ions due to their larger mass and consequently larger nuclear energy loss relative to helium. Quantitative information such as the sputtering yields, the energy-dependent aspect ratios and resolution-limiting effects are discussed.

  10. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, Bruce C.; Stutz, Roger A.

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  11. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, B.C.; Stutz, R.A.

    1998-06-30

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  12. Gabor lens focusing of a negative ion beam

    SciTech Connect

    Palkovic, J.A.; Mills, F.E.; Schmidt, C.; Young, D.E.

    1989-05-01

    Gabor or plasma lenses have previously been used to focus intense beams of positive ions at energies from 10 keV to 5 MeV. It is the large electrostatic field of the non-neutral plasma in the Gabor lens which is responsible for the focusing. Focusing an ion beam with a given sign of charge in a Gabor lens requires a non-neutral plasma with the opposite sign of charge as the beam. A Gabor lens constructed at Fermilab has been used to focus a 30 keV proton beam with good optical quality. We discuss studies of the action of a Gabor lens on a beam of negative ions. A Gabor lens has been considered for matching an H/sup /minus// beam into an RFQ in the redesign of the low energy section of the Fermilab linac. 9 refs., 3 figs., 1 tab.

  13. A subnanosecond pulsed ion source for micrometer focused ion beams.

    PubMed

    Höhr, C; Fischer, D; Moshammer, R; Dorn, A; Ullrich, J

    2008-05-01

    A new, compact design of an ion source delivers nanosecond pulsed ion beams with low emittance, which can be focused to micrometer size. By using a high-power, 25 fs laser pulse focused into a gas region of 10(-6) mbar, ions at very low temperatures are produced in the small laser focal volume of 5 mum diameter by 20 mum length through multiphoton ionization. These ions are created in a cold environment, not in a hot plasma, and, since the ionization process itself does not significantly heat them, have as a result essentially room temperature. The generated ion pulse, up to several thousand ions per pulse, is extracted from the source volume with ion optical elements that have been carefully designed by simulation calculations. Externally triggered, its subnanosecond duration and even smaller time jitter allow it to be superimposed with other pulsed particle or laser beams. It therefore can be combined with any type of collision experiment where the size and the time structure of the projectile beam crucially affect the achievable experimental resolution.

  14. Metal assisted focused-ion beam nanopatterning

    NASA Astrophysics Data System (ADS)

    Kannegulla, Akash; Cheng, Li-Jing

    2016-09-01

    Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates.

  15. Metal assisted focused-ion beam nanopatterning.

    PubMed

    Kannegulla, Akash; Cheng, Li-Jing

    2016-09-01

    Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates. PMID:27479713

  16. Focused ion beam in dental research.

    PubMed

    Ngo, H; Cairney, J; Munroe, P; Vargas, M; Mount, G

    2000-11-01

    Focused ion beam (FIB) has been available for over 10 yrs but until recently its usage has been confined to the semiconductor industry. It has been developed as an important tool in defect analysis, circuit modification and recently transmission electron microscope sample preparation. This paper introduces FIB and demonstrates its application in dental research. Its ion and electron imaging modes complement the SEM while its ability to prepare TEM samples from a wide range of material will allow the study of new types of adhesive interface. As an example, its use is described in the characterization of the interface of resin to a tribochemically treated surface of an experimental fiber-reinforced resin-based composite. As with all new techniques, the initial learning curve was difficult to manage. This new instrument offers opportunities to expand research in dental materials to areas not possible before.

  17. Focused ion beams using a high-brightness plasma source

    NASA Astrophysics Data System (ADS)

    Guharay, Samar

    2002-10-01

    High-brightness ion beams, with low energy spread, have merits for many new applications in microelectronics, materials science, and biology. Negative ions are especially attractive for the applications that involve beam-solid interactions. When negative ions strike a surface, especially an electrically isolated surface, the surface charging voltage is limited to few volts [1]. This property can be effectively utilized to circumvent problems due to surface charging, such as device damage and beam defocusing. A compact plasma source, with the capability to deliver either positive or negative ion beams, has been developed. H- beams from this pulsed source showed brightness within an order of magnitude of the value for beams from liquid-metal ion sources. The beam angular intensity is > 40 mAsr-1 and the corresponding energy spread is <2.5 eV [2]. Using a simple Einzel lens with magnification of about 0.1, a focused current density of about 40 mAcm-2 is obtained. It is estimated that an additional magnification of about 0.1 can yield a focused current density of > 1 Acm-2 and a spot size of 100 nm. Such characteristics of focused beam parameters, using a dc source, will immediately open up a large area of new applications. [1] P. N. Guzdar, A. S. Sharma, S. K. Guharay, "Charging of substrates irradiated by particle beams" Appl. Phys. Lett. 71, 3302 (1997). [2] S. K. Guharay, E. Sokolovsky, J. Orloff, "Characteristics of ion beams from a Penning source for focused ion beam applications" J. Vac. Sci Technol. B17, 2779 (1999).

  18. A Scaled Final Focus Experiment for Heavy Ion Fusion

    SciTech Connect

    MacLaren, Stephan, Alexander

    2000-09-19

    A one-tenth dimensionally scaled version of a final focus sub-system design for a heavy ion fusion driver is built and tested. By properly scaling the physics parameters that relate particle energy and mass, beam current, beam emittance, and focusing field, the transverse dynamics of a driver scale final focus are replicated in a small laboratory beam. The experiment uses a 95 {micro}A beam of 160 keV Cs{sup +} ions to study the dynamics as the beam is brought to a ballistic focus in a lattice of six quadrupole magnets. Diagnostic stations along the experiment track the evolution of the transverse phase space of the beam. The measured focal spot size is consistent with calculations and the report of the design on which the experiment is based. By uniformly varying the strengths of the focusing fields in the lattice, the chromatic effect of a small energy deviation on the spot size can be reproduced. This is done for {+-}1% and {+-}2% shifts and the changes in the focus are measured. Additionally, a 400 {micro}A beam is propagated through the experiment and partially neutralized after the last magnet using electrons released from a hot tungsten filament. The increase in beam current allows for the observation of significant effects on both the size and shape of the focal spot when the electrons are added.

  19. Development of a focused ion beam micromachining system

    SciTech Connect

    Pellerin, J.G.; Griffis, D.; Russell, P.E.

    1988-12-01

    Focused ion beams are currently being investigated for many submicron fabrication and analytical purposes. An FIB micromachining system consisting of a UHV vacuum system, a liquid metal ion gun, and a control and data acquisition computer has been constructed. This system is being used to develop nanofabrication and nanomachining techniques involving focused ion beams and scanning tunneling microscopes.

  20. EDITORIAL: Focus on Heavy Ions in Biophysics and Medical Physics FOCUS ON HEAVY IONS IN BIOPHYSICS AND MEDICAL PHYSICS

    NASA Astrophysics Data System (ADS)

    Durante, Marco

    2008-07-01

    include carcinogenesis, late degenerative tissue effects (including damage to the central nervous system), and hereditary effects. For these studies, microbeams represent an essential tool, considering that in space each cell in the human body will not experience more than one heavy-ion traversal. Both NASA and ESA are investing important resources in ground-based space radiation research programs, to reduce risk uncertainty and to develop countermeasures. For both cancer therapy and space radiation protection a better understanding of the effects of energetic heavy ions is needed. Physics should be improved, especially the measurements of nuclear fragmentation cross-sections, and the transport calculations. Biological effects need to be studied in greater detail, and clearly only understanding the mechanisms of heavy-ion induced biological damage will reduce the uncertainty on late effects in humans. This focus issue of New Journal of Physics aims to provide the state-of-the-art of the biophysics of energetic heavy ions and to highlight the areas where more research is urgently needed for therapy and the space program. Focus on Heavy Ions in Biophysics and Medical Physics Contents Heavy ion microprobes: a unique tool for bystander research and other radiobiological applications K O Voss, C Fournier and G Taucher-Scholz Heavy ions light flashes and brain functions: recent observations at accelerators and in spaceflight L Narici Clinical advantages of carbon-ion radiotherapy Hirohiko Tsujii, Tadashi Kamada, Masayuki Baba, Hiroshi Tsuji, Hirotoshi Kato, Shingo Kato, Shigeru Yamada, Shigeo Yasuda, Takeshi Yanagi, Hiroyuki Kato, Ryusuke Hara, Naotaka Yamamoto and Junetsu Mizoe Heavy-ion effects: from track structure to DNA and chromosome damage F Ballarini, D Alloni, A Facoetti and A Ottolenghi Shielding experiments with high-energy heavy ions for spaceflight applications C Zeitlin, S Guetersloh, L Heilbronn, J Miller, N Elkhayari, A Empl, M LeBourgeois, B W Mayes, L Pinsky

  1. Laser-driven inertial ion focusing.

    PubMed

    Zhuo, H B; Yu, Wei; Yu, M Y; Xu, H; Wang, X; Shen, B F; Sheng, Z M; Zhang, J

    2009-01-01

    A Hohlraum-like configuration is proposed for realizing a simple compact source for neutrons. A laser pulse enters a tiny thin-shelled hollow-sphere target through a small opening and is self-consistently trapped in the cavity. The electrons in the inner shell-wall region are expelled by the light pressure. The resulting space-charge field compresses the local ions into a thin layer that becomes strongly heated. An inward expansion of ions into the shell cavity then occurs, resulting in the formation at the cavity center of a hot spot of ions at high density and temperature, similar to that in inertial electrostatic confinement.

  2. Scanning ion microscopy with low energy lithium ions.

    PubMed

    Twedt, Kevin A; Chen, Lei; McClelland, Jabez J

    2014-07-01

    Using an ion source based on photoionization of laser-cooled lithium atoms, we have developed a scanning ion microscope with probe sizes of a few tens of nanometers and beam energies from 500eV to 5keV. These beam energies are much lower than the typical operating energies of the helium ion microscope or gallium focused ion beam systems. We demonstrate how low energy can be advantageous in ion microscopy when detecting backscattered ions, due to a decreased interaction volume and the potential for surface sensitive composition analysis. As an example application that demonstrates these advantages, we non-destructively image the removal of a thin residual resist layer during plasma etching in a nano-imprint lithography process.

  3. EDITORIAL: Focus on Heavy Ions in Biophysics and Medical Physics FOCUS ON HEAVY IONS IN BIOPHYSICS AND MEDICAL PHYSICS

    NASA Astrophysics Data System (ADS)

    Durante, Marco

    2008-07-01

    include carcinogenesis, late degenerative tissue effects (including damage to the central nervous system), and hereditary effects. For these studies, microbeams represent an essential tool, considering that in space each cell in the human body will not experience more than one heavy-ion traversal. Both NASA and ESA are investing important resources in ground-based space radiation research programs, to reduce risk uncertainty and to develop countermeasures. For both cancer therapy and space radiation protection a better understanding of the effects of energetic heavy ions is needed. Physics should be improved, especially the measurements of nuclear fragmentation cross-sections, and the transport calculations. Biological effects need to be studied in greater detail, and clearly only understanding the mechanisms of heavy-ion induced biological damage will reduce the uncertainty on late effects in humans. This focus issue of New Journal of Physics aims to provide the state-of-the-art of the biophysics of energetic heavy ions and to highlight the areas where more research is urgently needed for therapy and the space program. Focus on Heavy Ions in Biophysics and Medical Physics Contents Heavy ion microprobes: a unique tool for bystander research and other radiobiological applications K O Voss, C Fournier and G Taucher-Scholz Heavy ions light flashes and brain functions: recent observations at accelerators and in spaceflight L Narici Clinical advantages of carbon-ion radiotherapy Hirohiko Tsujii, Tadashi Kamada, Masayuki Baba, Hiroshi Tsuji, Hirotoshi Kato, Shingo Kato, Shigeru Yamada, Shigeo Yasuda, Takeshi Yanagi, Hiroyuki Kato, Ryusuke Hara, Naotaka Yamamoto and Junetsu Mizoe Heavy-ion effects: from track structure to DNA and chromosome damage F Ballarini, D Alloni, A Facoetti and A Ottolenghi Shielding experiments with high-energy heavy ions for spaceflight applications C Zeitlin, S Guetersloh, L Heilbronn, J Miller, N Elkhayari, A Empl, M LeBourgeois, B W Mayes, L Pinsky

  4. Initial results from the Wisconsin Spherically Convergent Ion Focus experiment

    SciTech Connect

    Thorson, T.A.; Durst, R.D.; Fonck, R.J.; Foucher, B.S.; Wainwright, L.P.

    1995-12-31

    The Spherically Convergent Ion Focus (SCIF) is an alternative plasma confinement scheme in which ions are electrostatically confined, accelerated, and concentrated at fusion-relevant energies. This concept has been recently promoted for various near-term applications including waste disposal, particle production, neutron radiography and tomography, plastic explosive detection, materials research, and medical isotope production. The Wisconsin SCIF experiments are designed to evaluate the practicality of the SCIF concept for given applications. In the experiment, a wire globe serves as a simple means of producing the trapping potential well and the ion source consists of a cold, uniform plasma at the edge. Hydrogen ions formed from the background neutral gas are typically accelerated to energies of 5--20 kV, and measured cathode grid currents approach the space-charge limit for concentric spheres. Core size measurements utilize spectrally-filtered CCD camera images of the visible emission from the core region, and the minimal observed core radius of 0.6 cm (HWHM) is within a factor of 2--3 of the theoretical convergence ratio for the device. Neutral particle interactions and potential asymmetries imposed by the grid lead to non-ideal convergence, as evidenced by measured potential asymmetries and core size dependence on cathode grid spacing. Floating probes with 30 kV isolation have allowed unique measurements of the density, electric potential and temperature in the converged core. The ratio of core to edge density is 10--20, which is in good agreement with scaling from radial flux conservation.

  5. Imaging Nanophotonic Modes of Microresonators using a Focused Ion Beam

    PubMed Central

    Twedt, Kevin A.; Zou, Jie; Davanco, Marcelo; Srinivasan, Kartik; McClelland, Jabez J.; Aksyuk, Vladimir A.

    2016-01-01

    Optical microresonators have proven powerful in a wide range of applications, including cavity quantum electrodynamics1–3, biosensing4, microfludics5, and cavity optomechanics6–8. Their performance depends critically on the exact distribution of optical energy, confined and shaped by the nanoscale device geometry. Near-field optical probes9 can image this distribution, but the physical probe necessarily perturbs the near field, which is particularly problematic for sensitive high quality factor resonances10,11. We present a new approach to mapping nanophotonic modes that uses a controllably small and local optomechanical perturbation introduced by a focused lithium ion beam12. An ion beam (radius ≈50 nm) induces a picometer-scale dynamic deformation of the resonator surface, which we detect through a shift in the optical resonance wavelength. We map five modes of a silicon microdisk resonator (Q≥20,000) with both high spatial and spectral resolution. Our technique also enables in-situ observation of ion implantation damage and relaxation dynamics in a silicon lattice13,14. PMID:27087832

  6. Novel patterns by focused ion beam guided anodization.

    PubMed

    Chen, Bo; Lu, Kathy; Tian, Zhipeng

    2011-01-18

    Focused ion beam patterning is a powerful technique for guiding the growth of ordered hexagonal porous anodic alumina. This study shows that, with the guidance of the focused ion beam patterning, hexagonal porous anodic alumina with interpore distances from 200 to 425 nm can be fabricated at 140 V in 0.3 M phosphoric acid. When the interpore distance is increased to 500 nm, alternating diameter nanopore arrays are synthesized with the creation and growth of new small pores at the junctions of three large neighboring pores. Moreover, alternating diameter nanopore arrays in hexagonal arrangement are fabricated by focused ion beam patterning guided anodization. Interpore distance is an important parameter affecting the arrangement of alternating diameter nanopore arrays. Different types of novel patterns are obtained by designing different focused ion beam concave arrays. The fundamental understanding of the process is discussed.

  7. Funnel cone for focusing intense ion beams on a target

    SciTech Connect

    Bieniosek, F.M.; Henestroza, E.; Ni, P.

    2009-10-05

    We describe a funnel cone for concentrating an ion beam on a target. The cone utilizes the reflection characteristic of ion beams on solid walls to focus the incident beam andincrease beam intensity on target. The cone has been modeled with the TRIM code. A prototype has been tested and installed for use in the 350-keV K+ NDCX target chamber.

  8. Close Up Special Focus: Energy.

    ERIC Educational Resources Information Center

    Mayer, Fritz; And Others

    Designed to accompany a 30-minute seminar televised over the Cable Satellite Public Affairs Network (C-SPAN), this handbook contains 4 readings on energy for high school students. Following an introduction on energy policy formulation, the first selection outlines the role of nuclear energy in America's future. Included are insets on the operation…

  9. Diagnostics of ion beam generated from a Mather type plasma focus device

    SciTech Connect

    Lim, L. K. Ngoi, S. K. Wong, C. S. Yap, S. L.

    2014-03-05

    Diagnostics of ion beam emission from a 3 kJ Mather-type plasma focus device have been performed for deuterium discharge at low pressure regime. Deuterium plasma focus was found to be optimum at pressure of 0.2 mbar. The energy spectrum and total number of ions per shot from the pulsed ion beam are determined by using biased ion collectors, Faraday cup, and solid state nuclear track detector CR-39. Average energy of the ion beam obtained is about 60 keV. Total number of the ions has been determined to be in the order of 10{sup 11} per shot. Solid state nuclear track detectors (SSNTD) CR39 are employed to measure the particles at all angular direction from end on (0°) to side on (90°). Particle tracks are registered by SSNTD at 30° to 90°, except the one at the end-on 0°.

  10. Energy Focusability of Annular Beams

    NASA Astrophysics Data System (ADS)

    Astadjov, Dimo N.

    2010-01-01

    A simulation of coherent annular flat two-level beams by two-dimensional Fast Fourier Transform is presented. After parameterization of the source beam (the `input') we examined the influence of its parameters on the shape and proportions of the output beam profile. The output pattern has a prominent central peak and faint rings concentrically surrounding it. The fraction of the central peak energy to the whole energy of beam, PF0 gives a notion of energy spread within the focal spot: PF0 is a function of beam annularity, k (i.e. `inside diameter/outside diameter' ratio) and the intensity dip, Idip of annulus central area (i.e. ring intensity minus central-bottom intensity, normalized). Up to k = 0.8 and Idip = 0.75, PF0 does not change too much—it is ⩾0.7 which is ⩾90% of PF0 maximum (0.778 at k = 0 and Idip = 0). Simulations revealed that even great changes in the shape of input beam annulus lead to small variations in the energy spread of output beam profile in the range of practical use of coherent annular beams.

  11. Needs of Non-Energy Focused Contractors

    SciTech Connect

    Liakus, C.

    2012-12-01

    To better understand the informational needs of non-energy focused contractors, including what information they need to motivate them to become energy-focused, the BARA team studied the type of information provided by the national programs, trade associations, and manufacturers that were researched for the related technical report: Effective Communication of Energy Efficiency. While that report focused on the delivery method, format, and strategy of the information, this study examines the content being put forward.

  12. Needs of Non Energy-Focused Contractors

    SciTech Connect

    Liaukus, C.

    2012-12-01

    To better understand the informational needs of non energy-focused contractors, including what information they need to motivate them to become energy-focused, the BARA team studied the type of information provided by the national programs, trade associations, and manufacturers that were researched for the related technical report: Effective Communication of Energy Efficiency. While that report focused on the delivery method, format, and strategy of the information, this study examines the content being put forward.

  13. Whole-cell imaging at nanometer resolutions using fast and slow focused helium ions.

    PubMed

    Chen, Xiao; Udalagama, Chammika N B; Chen, Ce-Belle; Bettiol, Andrew A; Pickard, Daniel S; Venkatesan, T; Watt, Frank

    2011-10-01

    Observations of the interior structure of cells and subcellular organelles are important steps in unraveling organelle functions. Microscopy using helium ions can play a major role in both surface and subcellular imaging because it can provide subnanometer resolutions at the cell surface for slow helium ions, and fast helium ions can penetrate cells without a significant loss of resolution. Slow (e.g., 10-50 keV) helium ion beams can now be focused to subnanometer dimensions (∼0.25 nm), and keV helium ion microscopy can be used to image the surfaces of cells at high resolutions. Because of the ease of neutralizing the sample charge using a flood electron beam, surface charging effects are minimal and therefore cell surfaces can be imaged without the need for a conducting metallic coating. Fast (MeV) helium ions maintain a straight path as they pass through a cell. Along the ion trajectory, the helium ion undergoes multiple electron collisions, and for each collision a small amount of energy is lost to the scattered electron. By measuring the total energy loss of each MeV helium ion as it passes through the cell, we can construct an energy-loss image that is representative of the mass distribution of the cell. This work paves the way to use ions for whole-cell investigations at nanometer resolutions through structural, elemental (via nuclear elastic backscattering), and fluorescence (via ion induced fluorescence) imaging.

  14. Solenoidal Fields for Ion Beam Transport and Focusing

    SciTech Connect

    Lee, Edward P.; Leitner, Matthaeus

    2007-11-01

    In this report we calculate time-independent fields of solenoidal magnets that are suitable for ion beam transport and focusing. There are many excellent Electricity and Magnetism textbooks that present the formalism for magnetic field calculations and apply it to simple geometries [1-1], but they do not include enough relevant detail to be used for designing a charged particle transport system. This requires accurate estimates of fringe field aberrations, misaligned and tilted fields, peak fields in wire coils and iron, external fields, and more. Specialized books on magnet design, technology, and numerical computations [1-2] provide such information, and some of that is presented here. The AIP Conference Proceedings of the US Particle Accelerator Schools [1-3] contain extensive discussions of design and technology of magnets for ion beams - except for solenoids. This lack may be due to the fact that solenoids have been used primarily to transport and focus particles of relatively low momenta, e.g. electrons of less than 50 MeV and protons or H- of less than 1.0 MeV, although this situation may be changing with the commercial availability of superconducting solenoids with up to 20T bore field [1-4]. Internal reports from federal laboratories and industry treat solenoid design in detail for specific applications. The present report is intended to be a resource for the design of ion beam drivers for Inertial Fusion Energy [1-5] and Warm Dense Matter experiments [1-6], although it should also be useful for a broader range of applications. The field produced by specified currents and material magnetization can always be evaluated by solving Maxwell's equations numerically, but it is also desirable to have reasonably accurate, simple formulas for conceptual system design and fast-running beam dynamics codes, as well as for general understanding. Most of this report is devoted to such formulas, but an introduction to the Tosca{copyright} code [1-7] and some numerical

  15. Vortex focusing of ions produced in corona discharge.

    PubMed

    Kolomiets, Yuri N; Pervukhin, Viktor V

    2013-06-15

    Completeness of the ion transportation into an analytical path defines the efficiency of ionization analysis techniques. This is of particular importance for atmospheric pressure ionization sources like corona discharge, electrospray, ionization with radioactive ((3)H, (63)Ni) isotopes that produce nonuniform spatial distribution of sample ions. The available methods of sample ion focusing are either efficient at reduced pressure (~1Torr) or feature high sample losses. This paper deals with experimental research into atmospheric pressure focusing of unipolar (positive) ions using a highly swirled air stream with a well-defined vortex core. Effects of electrical fields from corona needle and inlet capillary of mass spectrometer on collection efficiency is considered. We used a corona discharge to produce an ionized unipolar sample. It is shown experimentally that with an electrical field barrier efficient transportation and focusing of an ionized sample are possible only when a metal plate restricting the stream and provided with an opening covered with a grid is used. This gives a five-fold increase of the transportation efficiency. It is shown that the electric field barrier in the vortex sampling region reduces the efficiency of remote ionized sample transportation two times. The difference in the efficiency of light ion focusing observed may be explained by a high mobility and a significant effect of the electric field barrier upon them. It is possible to conclude based on the experimental data that the presence of the field barrier narrows considerably (more than by one and half) the region of the vortex sample ion focusing. PMID:23618173

  16. Effects on focused ion beam irradiation on MOS transistors

    SciTech Connect

    Campbell, A.N.; Peterson, K.A.; Fleetwood, D.M.; Soden, J.M.

    1997-04-01

    The effects of irradiation from a focused ion beam (FIB) system on MOS transistors are reported systematically for the first time. Three MOS transistor technologies, with 0.5, 1, and 3 {mu}m minimum feature sizes and with gate oxide thicknesses ranging from 11 to 50 nm, were analyzed. Significant shifts in transistor parameters (such as threshold voltage, transconductance, and mobility) were observed following irradiation with a 30 keV Ga{sup +} focused ion beam with ion doses varying by over 5 orders of magnitude. The apparent damage mechanism (which involved the creation of interface traps, oxide trapped charge, or both) and extent of damage were different for each of the three technologies investigated.

  17. Ultrahigh vacuum focused ion beam micromill and articles therefrom

    DOEpatents

    Lamartine, B.C.; Stutz, R.A.

    1998-02-24

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  18. Ultrahigh vacuum focused ion beam micromill and articles therefrom

    DOEpatents

    Lamartine, Bruce C.; Stutz, Roger A.

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  19. Electrostatic lens to focus an ion beam to uniform density

    DOEpatents

    Johnson, Cleland H.

    1977-01-11

    A focusing lens for an ion beam having a gaussian or similar density profile is provided. The lens is constructed to provide an inner zero electrostatic field, and an outer electrostatic field such that ions entering this outer field are deflected by an amount that is a function of their distance from the edge of the inner field. The result is a beam that focuses to a uniform density in a manner analogous to that of an optical ring lens. In one embodiment, a conically-shaped network of fine wires is enclosed within a cylindrical anode. The wire net together with the anode produces a voltage field that re-directs the outer particles of the beam while the axial particles pass undeflected through a zero field inside the wire net. The result is a focused beam having a uniform intensity over a given target area and at a given distance from the lens.

  20. Revitalize Electrical Program with Renewable Energy Focus

    ERIC Educational Resources Information Center

    Karns, Robert J.

    2012-01-01

    Starting a renewable energy technology (RET) program can be as simple as shifting the teaching and learning focus of a traditional electricity program toward energy production and energy control systems. Redirecting curriculum content and delivery to address photovoltaic solar (PV solar) technology and small wind generation systems is a natural…

  1. Focusing in multiwell potentials: applications to ion channels.

    PubMed

    Ponzoni, L; Celardo, G L; Borgonovi, F; Kaplan, L; Kargol, A

    2013-05-01

    We investigate nonequilibrium stationary distributions induced by stochastic dichotomous noise in double-well and multiwell models of ion channel gating kinetics. The channel kinetics is analyzed using both overdamped Langevin equations and master equations. With the Langevin equation approach we show a nontrivial focusing effect due to the external stochastic noise, namely, the concentration of the probability distribution in one of the two wells of a double-well system or in one or more of the wells of the multiwell model. In the multiwell system, focusing in the outer wells is shown to be achievable under physiological conditions, while focusing in the central wells has proved possible so far only at very low temperatures. We also discuss the strength of the focusing effect and obtain the conditions necessary for maximal focusing to appear. These conditions cannot be predicted by a simple master equation approach.

  2. Development of Superconducting Focusing Quadrupoles for Heavy Ion Drivers

    SciTech Connect

    Martovetsky, N; Manahan, R; Lietzke, A F

    2001-09-10

    Heavy Ion Fusion (HIF) is exploring a promising path to a practical inertial-confinement fusion reactor. The associated heavy ion driver will require a large number of focusing quadrupole magnets. A concept for a superconducting quadrupole array, using many simple racetrack coils, was developed at LLNL. Two, single-bore quadrupole prototypes of the same design, with distinctly different conductor, were designed, built, and tested. Both prototypes reached their short sample currents with little or no training. Magnet design, and test results, are presented and discussed.

  3. Subcutoff microwave driven plasma ion sources for multielemental focused ion beam systems.

    PubMed

    Mathew, Jose V; Chowdhury, Abhishek; Bhattacharjee, Sudeep

    2008-06-01

    A compact microwave driven plasma ion source for focused ion beam applications has been developed. Several gas species have been experimented including argon, krypton, and hydrogen. The plasma, confined by a minimum B multicusp magnetic field, has good radial and axial uniformity. The octupole multicusp configuration shows a superior performance in terms of plasma density (~1.3 x 10(11) cm(-3)) and electron temperature (7-15 eV) at a power density of 5-10 Wcm(2). Ion current densities ranging from a few hundreds to over 1000 mA/cm(2) have been obtained with different plasma electrode apertures. The ion source will be combined with electrostatic Einzel lenses and should be capable of producing multielemental focused ion beams for nanostructuring and implantations. The initial simulation results for the focused beams have been presented.

  4. Radio frequency sustained ion energy

    DOEpatents

    Jassby, Daniel L.; Hooke, William M.

    1977-01-01

    Electromagnetic (E.M.) energy injection method and apparatus for producing and sustaining suprathermal ordered ions in a neutral, two-ion-species, toroidal, bulk equilibrium plasma. More particularly, the ions are produced and sustained in an ordered suprathermal state of existence above the average energy and velocity of the bulk equilibrium plasma by resonant rf energy injection in resonance with the natural frequency of one of the ion species. In one embodiment, the electromagnetic energy is injected to clamp the energy and velocity of one of the ion species so that the ion energy is increased, sustained, prolonged and continued in a suprathermal ordered state of existence containing appreciable stored energy that counteracts the slowing down effects of the bulk equilibrium plasma drag. Thus, selective deuteron absorption may be used for ion-tail creation by radio-frequency excitation alone. Also, the rf can be used to increase the fusion output of a two-component neutral injected plasma by selective heating of the injected deuterons.

  5. Atomic-scale thermocapillary flow in focused ion beam milling

    SciTech Connect

    Das, K.; Johnson, H. T.; Freund, J. B.

    2015-05-15

    Focused ion beams provide a means of nanometer-scale manufacturing and material processing, which is used for applications such as forming nanometer-scale pores in thin films for DNA sequencing. We investigate such a configuration with Ga{sup +} bombardment of a Si thin-film target using molecular dynamics simulation. For a range of ion intensities in a realistic configuration, a recirculating melt region develops, which is seen to flow with a symmetrical pattern, counter to how it would flow were it driven by the ion momentum flux. Such flow is potentially important for the shape and composition of the formed structures. Relevant stress scales and estimated physical properties of silicon under these extreme conditions support the importance thermocapillary effects. A flow model with Marangoni forcing, based upon the temperature gradient and geometry from the atomistic simulation, indeed reproduces the flow and thus could be used to anticipate such flows and their influence in applications.

  6. Superconducting focusing quadrupoles for heavy ion fusion experiments

    SciTech Connect

    Sabbi, G.L.; Faltens, A.; Leitner, M.; Lietzke, A.; Seidl, P.; Barnard, J.; Lund, S.; Martovetsky, N.; Gung, C.; Minervini, J.; Radovinsky, A.; Schultz, J.; Meinke, R.

    2003-05-01

    The Heavy Ion Fusion (HIF) Program is developing superconducting focusing magnets for both near-term experiments and future driver accelerators. In particular, single bore quadrupoles have been fabricated and tested for use in the High Current Experiment (HCX) at Lawrence Berkeley National Laboratory (LBNL). The next steps involve the development of magnets for the planned Integrated Beam Experiment (IBX) and the fabrication of the first prototype multi-beam focusing arrays for fusion driver accelerators. The status of the magnet R&D program is reported, including experimental requirements, design issues and test results.

  7. Focused ion beam milling of microchannels in lithium niobate

    PubMed Central

    Sridhar, Manoj; Maurya, Devendra K.; Friend, James R.; Yeo, Leslie Y.

    2012-01-01

    We present experimental and simulation results for focused ion beam (FIB) milling of microchannels in lithium niobate in this paper. We investigate two different cuts of lithium niobate, Y- and Z-cuts, and observe that the experimental material removal rate in the FIB for both Y-cut and Z-cut samples was 0.3 μm3/nC, roughly two times greater than the material removal rate previously reported in the literature but in good agreement with the value we obtain from stopping and range of ions in matter (SRIM) simulations. Further, we investigate the FIB milling rate and resultant cross-sectional profile of microchannels at various ion beam currents and find that the milling rate decreases as a function of ion dose and correspondingly, the cross-sectional profiles change from rectangular to V-shaped. This indicates that material redeposition plays an important role at high ion dose or equivalently, high aspect ratio. We find that the experimental material removal rate decreases as a function of aspect ratio of the milled structures, in good agreement with our simulation results at low aspect ratio and in good agreement with the material removal rates previously reported in the literature at high aspect ratios. Our results show that it is indeed easier than previously assumed to fabricate nanochannels with low aspect ratio directly on lithium niobate using the FIB milling technique. PMID:22662086

  8. Contamination analysis of radioactive samples in focused ion beam instruments.

    PubMed

    Evelan, Audrey Ruth; Brey, Richard R

    2013-02-01

    The use of Focused Ion Beam (FIB) instrument's to analyze and prepare samples that are radioactive requires attentiveness to the materials that are dislodged and free inside the chamber. Radioactive sputtered material must be understood even when observed at trace concentrations. Measurements using liquid scintillation counting and high purity germanium detectors were used to evaluate contamination on accessible surfaces inside a focused ion beam chamber that was used in the preparation of samples that were radioactive. The maximum removable contamination found was 0.27 0.4 Bq cm(-2), on the focused ion beam wall with 0.24 0.019 Bq cm(-2) on the door. Although these magnitudes of removable contamination are inconsequential for activation products, these same magnitudes of actinides, for example 239Pu, would represent 3.2% of an Annual Limit of Intake. This might be considered significant if one examines the relatively infrequent use of this device for the preparation of radioactive samples. Predicted activities of sputtered material were found using the software Transport of Ions in Matter, estimating that 0.003% of a radioactive samples activity is released into the FIB chamber. A used secondary electron detector's activity was measured to be 383.7 8.1 Bq. Preferential build-up of sputtered materials due to temperature or static charge gradients was considered. No temperature gradients were observed. Static charge gradients were measured inside the chamber varying between 0.057% below the mean to 34% higher than the mean. However, the magnitudes of contamination measured did not correlate to static charge gradients. Deposition in the chamber appears to have no mechanical cause but rather is sporadic however, measureable. Experience to date has been limited to samples of low activity; nevertheless, contamination inside the chamber was observed. Users should anticipate higher levels of readily dispersible radioactive contamination within the FIB as sample activity

  9. Amorphization induced by focused ion beam milling in metallic and electronic materials.

    PubMed

    Huh, Yoon; Hong, Ki Jung; Shin, Kwang Soo

    2013-08-01

    Focused ion beam (FIB) milling using high-energy gallium ions is widely used in the preparation of specimens for transmission electron microscopy (TEM). However, the energetic ion beam induces amorphization on the edge of specimens during milling, resulting in a mischievous influence on the clearness of high-quality transmission electron micrographs. In this work, the amorphization induced by the FIB milling was investigated by TEM for three kinds of materials, metallic materials in bulk shape, and semiconductive and electronic ceramic materials as a substrate for the deposition of thin films.

  10. Drift Compression and Final Focus Options for Heavy Ion Fusion

    SciTech Connect

    Hong Qin; Ronald C. Davidson; John J. Barnard; Edward P. Lee

    2005-02-14

    A drift compression and final focus lattice for heavy ion beams should focus the entire beam pulse onto the same focal spot on the target. We show that this requirement implies that the drift compression design needs to satisfy a self-similar symmetry condition. For un-neutralized beams, the Lie symmetry group analysis is applied to the warm-fluid model to systematically derive the self-similar drift compression solutions. For neutralized beams, the 1-D Vlasov equation is solved explicitly, and families of self-similar drift compression solutions are constructed. To compensate for the deviation from the self-similar symmetry condition due to the transverse emittance, four time-dependent magnets are introduced in the upstream of the drift compression such that the entire beam pulse can be focused onto the same focal spot.

  11. Safety focused modeling of lithium-ion batteries: A review

    NASA Astrophysics Data System (ADS)

    Abada, S.; Marlair, G.; Lecocq, A.; Petit, M.; Sauvant-Moynot, V.; Huet, F.

    2016-02-01

    Safety issues pertaining to Li-ion batteries justify intensive testing all along their value chain. However, progress in scientific knowledge regarding lithium based battery failure modes, as well as remarkable technologic breakthroughs in computing science, now allow for development and use of prediction tools to assist designers in developing safer batteries. Subsequently, this paper offers a review of significant modeling works performed in the area with a focus on the characterization of the thermal runaway hazard and their relating triggering events. Progress made in models aiming at integrating battery ageing effect and related physics is also discussed, as well as the strong interaction with modeling-focused use of testing, and the main achievements obtained towards marketing safer systems. Current limitations and new challenges or opportunities that are expected to shape future modeling activity are also put in perspective. According to market trends, it is anticipated that safety may still act as a restraint in the search for acceptable compromise with overall performance and cost of lithium-ion based and post lithium-ion rechargeable batteries of the future. In that context, high-throughput prediction tools capable of screening adequate new components properties allowing access to both functional and safety related aspects are highly desirable.

  12. EDITORIAL: Focus on high energy particles and atmospheric processes

    NASA Astrophysics Data System (ADS)

    Harrison, R. Giles; Nicoll, Keri; Takahashi, Yukihiro; Yair, Yoav

    2015-10-01

    The letters published in the ‘Focus issue on high energy particles and atmospheric processes’ serve to broaden the discussion about the influence of high energy particles on the atmosphere beyond their possible effects on clouds and climate. These letters link climate and meteorological processes with atmospheric electricity, atmospheric chemistry, high energy physics and aerosol science from the smallest molecular cluster ions through to liquid droplets. Progress in such a disparate and complex topic is very likely to benefit from continued interdisciplinary interactions between traditionally distinct science areas.

  13. Focused-ion-beam-induced deposition of superconducting nanowires

    NASA Astrophysics Data System (ADS)

    Sadki, E. S.; Ooi, S.; Hirata, K.

    2004-12-01

    Superconducting nanowires, with a critical temperature of 5.2K, have been synthesized using an ion-beam-induced deposition, with a gallium focused ion beam and tungsten carboxyl, W(CO)6, as precursor. The films are amorphous, with atomic concentrations of about 40%, 40%, and 20% for W, C, and Ga, respectively, 0K values of the upper critical field and coherence length of 9.5T and 5.9nm, respectively, are deduced from the resistivity data at different applied magnetic fields. The critical current density is Jc=1.5×105A /cm2 at 3K. This technique can be used as a template-free fabrication method for superconducting devices.

  14. Preliminary study on development of 300 Kv compact focused gaseous ion beam system

    SciTech Connect

    Ohkubo, T.; Ishii, Y.; Kamiya, T.; Miyake, Y.

    2013-04-19

    A new 300 kV compact focused gaseous ion beam (gas-FIB) system with three-stage acceleration lens was constructed at JAEA. The preliminary experiments of formation of the focused gaseous ion beams were carried out to show the availability of the gas-FIB system as a writing tool for 3D proton lithography. As a result of the experiments, it was proved that the focal point was kept at the same position under changing the kinetic energy but with keeping the kinetic energy ratio constant, which was defined as the ratio of kinetic energy in object side to that in image side for the third acceleration lens. This characteristic of the gas-FIB is a good point to advance the 3D proton lithography changing penetration depth in a sample by varying the beam energy.

  15. Focused Ion Beam Microscopy of ALH84001 Carbonate Disks

    NASA Technical Reports Server (NTRS)

    Thomas-Keprta, Kathie L.; Clemett, Simon J.; Bazylinski, Dennis A.; Kirschvink, Joseph L.; McKay, David S.; Vali, Hojatollah; Gibson, Everett K., Jr.; Romanek, Christopher S.

    2005-01-01

    Our aim is to understand the mechanism(s) of formation of carbonate assemblages in ALH84001. A prerequisite is that a detailed characterization of the chemical and physical properties of the carbonate be established. We present here analyses by transmission electron microscopy (TEM) of carbonate thin sections produced by both focused ion beam (FIB) sectioning and ultramicrotomy. Our results suggest that the formation of ALH84001 carbonate assemblages were produced by considerably more complex process(es) than simple aqueous precipitation followed by partial thermal decomposition as proposed by other investigators [e.g., 1-3].

  16. Photoluminescence Imaging of Focused Ion Beam Induced Individual Quantum Dots

    SciTech Connect

    Lee, Jieun; Saucer, Timothy W.; Martin, Andrew J.; Tien, Deborah; Millunchick, Joanna M.; Sih, Vanessa

    2011-02-08

    We report on scanning microphotoluminescence measurements that spectrally and spatially resolve emission from individual InAs quantum dots that were induced by focused ion beam patterning. Multilayers of quantum dots were spaced 2 μm apart, with a minimum single dot emission line width of 160 μeV, indicating good optical quality for dots patterned using this technique. Mapping 16 array sites, at least 65% were occupied by optically active dots and the spectral inhomogeneity was within 30 meV.

  17. Laser and focused ion beam combined machining for micro dies.

    PubMed

    Yoshida, Y; Okazaki, W; Uchida, T

    2012-02-01

    We have developed a laser and focused ion beam (FIB) compound process for press mold dies of a micro lens array (MLA) and a micro needle array (MNA) in a glassy carbon (GC). The press mold die of the MLA was roughly fabricated by UV-YAG laser. After this process, we finished this surface by scanning FIB. As a result, higher accuracy and good roughness of surface profile can be realized. An optical glass is used to confirm the shape of lens. Moreover, we fabricated 6 × 6 through-holes in the GC by the spiral drilling in addition to the focus position movement of the UV laser for press mold die of the MNA. After the FIB process, we were able to make the needle die of surface and hole wall roughness less than 0.9 μm. A silicon rubber is used to confirm the shape of the holes.

  18. High speed focused ion and electron beam nanofabrication

    NASA Astrophysics Data System (ADS)

    Melngailis, John

    2009-03-01

    Both focused ion beams and electron beams can be used for direct, maskless, resistless nanofabrication as well as for lithography. So far the direct fabrication has been limited to applications such as photomask repair, circuit restructuring, failure analysis, and the creation of various highly specialized structures. Recent developments in maskless fabrication, so far aimed mainly at to resist exposure, suggest that this picture might change. For example, IMS in Vienna, Austria is developing an instrument that can be characterized as an ion beam or electron beam dot matrix printer. The total current on the sample available from this kind of instrument is at least three orders of magnitude larger than from a single beam instrument. This may lead to new applications of charged particle beam fabrication, as well as enable applications considered in the past but rejected because of very low throughput. An example of one such application is the direct writing of the identity in RFID tags using ion beam implantation. Recently we have also shown that electron beams can be used to deposit relatively pure platinum from an inorganic precursor gas, Pt(PF3)4. Such metal deposits can be used as contacts to carbon nanotubes, semiconductor nano wires, organic fibers, or other structures where conventional lithography is impractical.

  19. Evaluation of neon focused ion beam milling for TEM sample preparation.

    PubMed

    Pekin, T C; Allen, F I; Minor, A M

    2016-10-01

    Gallium-based focused ion beams generated from liquid-metal sources are widely used in micromachining and sample preparation for transmission electron microscopy, with well-known drawbacks such as sample damage and contamination. In this work, an alternative (neon) focused ion beam generated by a gas field-ionization source is evaluated for the preparation of electron-transparent specimens. To do so, electron-transparent sections of Si and an Al alloy are prepared with both Ga and Ne ion beams for direct comparison. Diffraction-contrast imaging and energy dispersive x-ray spectroscopy are used to evaluate the relative damage induced by the two beams, and cross-sections of milled trenches are examined to compare the implantation depth with theoretical predictions from Monte Carlo simulations. Our results show that for the beam voltages and materials systems investigated, Ne ion beam milling does not significantly reduce the focused ion beam induced artefacts. However, the Ne ion beam does enable more precise milling and may be of interest in cases where Ga contamination cannot be tolerated. PMID:27172066

  20. Evaluation of neon focused ion beam milling for TEM sample preparation.

    PubMed

    Pekin, T C; Allen, F I; Minor, A M

    2016-10-01

    Gallium-based focused ion beams generated from liquid-metal sources are widely used in micromachining and sample preparation for transmission electron microscopy, with well-known drawbacks such as sample damage and contamination. In this work, an alternative (neon) focused ion beam generated by a gas field-ionization source is evaluated for the preparation of electron-transparent specimens. To do so, electron-transparent sections of Si and an Al alloy are prepared with both Ga and Ne ion beams for direct comparison. Diffraction-contrast imaging and energy dispersive x-ray spectroscopy are used to evaluate the relative damage induced by the two beams, and cross-sections of milled trenches are examined to compare the implantation depth with theoretical predictions from Monte Carlo simulations. Our results show that for the beam voltages and materials systems investigated, Ne ion beam milling does not significantly reduce the focused ion beam induced artefacts. However, the Ne ion beam does enable more precise milling and may be of interest in cases where Ga contamination cannot be tolerated.

  1. Preliminary Studies of Ions Emission in a Small Plasma Focus Device of Hundreds of Joules

    SciTech Connect

    Moreno, Jose; Pavez, Cristian; Soto, Leopoldo; Tarifeno, Ariel; Reymond, Piotr; Verschueren, Nicolas; Ariza, Pablo

    2009-01-21

    Ion beam emission in plasma focus (PF) discharges was originally investigated to explain the strong forward anisotropy observed in the neutron. Several properties of PF emitted deuteron beams have been measured, including their angular distributions and energy spectra in devices operating with energies from 1 kJ to 1 MJ. At present there is a growing interest in the development of very small PF devices operating under 1 kJ. As part of the characterization program of the very low energy PF devices (<1 kJ) developed at the Chilean Nuclear Energy Commission, the charges particle emission in hydrogen (H{sub 2}) and mixture (H{sub 2}+%Ar) are being studied. In order to obtain an estimation of the ions energy spectrum and ionization grade, by using time of flight method, a graphite collector system operating in the bias ion collector mode was constructed and it is being used. Preliminary results of the ion beams measurements in different experimental conditions, at a plasma focus device of 400 joules (PF-400 J) are presented.

  2. Ion emittance growth due to focusing modulation from slipping electron bunch

    SciTech Connect

    Wang, G.

    2015-02-17

    Low energy RHIC operation has to be operated at an energy ranging from γ = 4.1 to γ = 10. The energy variation causes the change of revolution frequency. While the rf system for the circulating ion will operate at an exact harmonic of the revolution frequency (h=60 for 4.5 MHz rf and h=360 for 28 MHz rf.), the superconducting rf system for the cooling electron beam does not have a frequency tuning range that is wide enough to cover the required changes of revolution frequency. As a result, electron bunches will sit at different locations along the ion bunch from turn to turn, i.e. the slipping of the electron bunch with respect to the circulating ion bunch. At cooling section, ions see a coherent focusing force due to the electrons’ space charge, which differs from turn to turn due to the slipping. We will try to estimate how this irregular focusing affects the transverse emittance of the ion bunch.

  3. Low energy ion-molecule reactions

    SciTech Connect

    Farrar, J.M.

    1993-12-01

    This project is concerned with elucidating the dynamics of elementary ion-molecule reactions at collision energies near and below 1 eV. From measurements of the angular and energy distributions of the reaction products, one can infer intimathe details about the nature of collisions leading to chemical reaction, the geometries and lifetimes of intermediate complexes that govern the reaction dynamics, and the collision energy dependence of these dynamical features. The author employs crossed-beam low energy mass spectrometry technology developed over the last several years, with the focus of current research on proton transfer and hydrogen atom transfer reactions of te O{sup {minus}} ion with species such as HF, H{sub 2}O, and NH{sub 3}.

  4. Low-Energy Ions from Laser-Cooled Atoms

    NASA Astrophysics Data System (ADS)

    Shayeganrad, G.; Fioretti, A.; Guerri, I.; Tantussi, F.; Ciampini, D.; Allegrini, M.; Viteau, M.; Fuso, F.

    2016-05-01

    We report the features of an ion source based on two-color photoionization of a laser-cooled cesium beam outsourced from a pyramidal magneto-optical trap. The ion source operates in continuous or pulsed mode. At acceleration voltages below 300 V, it delivers some ten ions per bunch with a relative energy spread Δ Urms/U ≃0.032 , as measured through the retarding field-energy-analyzer approach. Space-charge effects are negligible thanks to the low ion density attained in the interaction volume. The performances of the ion beam in a configuration using focused laser beams are extrapolated on the basis of the experimental results. Calculations demonstrate that our low-energy and low-current ion beam can be attractive for the development of emerging technologies requiring the delivery of a small amount of charge, down to the single-ion level and its eventual focusing in the 10-nm range.

  5. Bright focused ion beam sources based on laser-cooled atoms

    PubMed Central

    McClelland, J. J.; Steele, A. V.; Knuffman, B.; Twedt, K. A.; Schwarzkopf, A.; Wilson, T. M.

    2016-01-01

    Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a new type of FIB source has emerged, which uses ionization of laser cooled neutral atoms to produce the ion beam. The extremely cold temperatures attainable with laser cooling (in the range of 100 μK or below) result in a beam of ions with a very small transverse velocity distribution. This corresponds to a source with extremely high brightness that rivals or may even exceed the brightness of the industry standard Ga+ liquid metal ion source. In this review we discuss the context of ion beam technology in which these new ion sources can play a role, their principles of operation, and some examples of recent demonstrations. The field is relatively new, so only a few applications have been demonstrated, most notably low energy ion microscopy with Li ions. Nevertheless, a number of promising new approaches have been proposed and/or demonstrated, suggesting that a rapid evolution of this type of source is likely in the near future. PMID:27239245

  6. Bright focused ion beam sources based on laser-cooled atoms

    NASA Astrophysics Data System (ADS)

    McClelland, J. J.; Steele, A. V.; Knuffman, B.; Twedt, K. A.; Schwarzkopf, A.; Wilson, T. M.

    2016-03-01

    Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a new type of FIB source has emerged, which uses ionization of laser cooled neutral atoms to produce the ion beam. The extremely cold temperatures attainable with laser cooling (in the range of 100 μK or below) result in a beam of ions with a very small transverse velocity distribution. This corresponds to a source with extremely high brightness that rivals or may even exceed the brightness of the industry standard Ga+ liquid metal ion source. In this review, we discuss the context of ion beam technology in which these new ion sources can play a role, their principles of operation, and some examples of recent demonstrations. The field is relatively new, so only a few applications have been demonstrated, most notably low energy ion microscopy with Li ions. Nevertheless, a number of promising new approaches have been proposed and/or demonstrated, suggesting that a rapid evolution of this type of source is likely in the near future.

  7. A compact broadband ion beam focusing device based on laser-driven megagauss thermoelectric magnetic fields.

    PubMed

    Albertazzi, B; d'Humières, E; Lancia, L; Dervieux, V; Antici, P; Böcker, J; Bonlie, J; Breil, J; Cauble, B; Chen, S N; Feugeas, J L; Nakatsutsumi, M; Nicolaï, P; Romagnani, L; Shepherd, R; Sentoku, Y; Swantusch, M; Tikhonchuk, V T; Borghesi, M; Willi, O; Pépin, H; Fuchs, J

    2015-04-01

    Ultra-intense lasers can nowadays routinely accelerate kiloampere ion beams. These unique sources of particle beams could impact many societal (e.g., proton-therapy or fuel recycling) and fundamental (e.g., neutron probing) domains. However, this requires overcoming the beam angular divergence at the source. This has been attempted, either with large-scale conventional setups or with compact plasma techniques that however have the restriction of short (<1 mm) focusing distances or a chromatic behavior. Here, we show that exploiting laser-triggered, long-lasting (>50 ps), thermoelectric multi-megagauss surface magnetic (B)-fields, compact capturing, and focusing of a diverging laser-driven multi-MeV ion beam can be achieved over a wide range of ion energies in the limit of a 5° acceptance angle.

  8. A compact broadband ion beam focusing device based on laser-driven megagauss thermoelectric magnetic fields.

    PubMed

    Albertazzi, B; d'Humières, E; Lancia, L; Dervieux, V; Antici, P; Böcker, J; Bonlie, J; Breil, J; Cauble, B; Chen, S N; Feugeas, J L; Nakatsutsumi, M; Nicolaï, P; Romagnani, L; Shepherd, R; Sentoku, Y; Swantusch, M; Tikhonchuk, V T; Borghesi, M; Willi, O; Pépin, H; Fuchs, J

    2015-04-01

    Ultra-intense lasers can nowadays routinely accelerate kiloampere ion beams. These unique sources of particle beams could impact many societal (e.g., proton-therapy or fuel recycling) and fundamental (e.g., neutron probing) domains. However, this requires overcoming the beam angular divergence at the source. This has been attempted, either with large-scale conventional setups or with compact plasma techniques that however have the restriction of short (<1 mm) focusing distances or a chromatic behavior. Here, we show that exploiting laser-triggered, long-lasting (>50 ps), thermoelectric multi-megagauss surface magnetic (B)-fields, compact capturing, and focusing of a diverging laser-driven multi-MeV ion beam can be achieved over a wide range of ion energies in the limit of a 5° acceptance angle. PMID:25933857

  9. A compact broadband ion beam focusing device based on laser-driven megagauss thermoelectric magnetic fields

    NASA Astrophysics Data System (ADS)

    Albertazzi, B.; d'Humières, E.; Lancia, L.; Dervieux, V.; Antici, P.; Böcker, J.; Bonlie, J.; Breil, J.; Cauble, B.; Chen, S. N.; Feugeas, J. L.; Nakatsutsumi, M.; Nicolaï, P.; Romagnani, L.; Shepherd, R.; Sentoku, Y.; Swantusch, M.; Tikhonchuk, V. T.; Borghesi, M.; Willi, O.; Pépin, H.; Fuchs, J.

    2015-04-01

    Ultra-intense lasers can nowadays routinely accelerate kiloampere ion beams. These unique sources of particle beams could impact many societal (e.g., proton-therapy or fuel recycling) and fundamental (e.g., neutron probing) domains. However, this requires overcoming the beam angular divergence at the source. This has been attempted, either with large-scale conventional setups or with compact plasma techniques that however have the restriction of short (<1 mm) focusing distances or a chromatic behavior. Here, we show that exploiting laser-triggered, long-lasting (>50 ps), thermoelectric multi-megagauss surface magnetic (B)-fields, compact capturing, and focusing of a diverging laser-driven multi-MeV ion beam can be achieved over a wide range of ion energies in the limit of a 5° acceptance angle.

  10. Energetic Ion Beam Production by a Low-Pressure Plasma Focus Discharge

    SciTech Connect

    Lim, L. K.; Yap, S. L.; Wong, C. S.

    2011-03-30

    Energetic ion beam emissions in a 3 kJ Mather type plasma focus operating at low-pressure regime are investigated. Deuterium gas is used and the discharge is operated in a low-pressure regime of below 1 mbar. Formation of the current sheath during the breakdown phase at the back wall is assisted by a set delayed trigger pulse. Energetic and intense ion beams with good reproducibility have been obtained for the operating pressure ranging from 0.05 mbar to 0.5 mbar. Deuteron beam is determined by time resolved measurement by making use of three biased ion collectors placed at the end on direction. The average energies of deuteron beams are resolved by using time-of flight method. Correlation between the ion emissions and the current sheath dynamics is also discussed.

  11. Modeling Electron Clouds in High-Current Ion Accelerators with Solenoid Focusing

    NASA Astrophysics Data System (ADS)

    Sharp, W. M.; Cohen, R. H.; Grote, D. P.; Vay, J.-L.; Haber, I.

    2006-10-01

    Contamination from electrons is a concern for solenoid-focused ion accelerators being developed for experiments in high-energy-density physics (HEDP). These electrons, produced directly by beam ions hitting lattice elements or indirectly by ionization of desorbed neutral gas, can potentially alter the beam dynamics, leading to beam deflection, increased emittance, halo, and possibly electron-ion instabilities. The electrostatic particle-in-cell code WARP is used to simulate electron-cloud studies on the solenoid-transport experiment (STX) at Lawrence Berkeley National Laboratory. We present self-consistent simulations of several STX configurations to show the evolution of the electron and ion-beam distributions first in idealized 2-D solenoid fields and then in the 3-D field values obtained from probes. Comparisons are made with experimental data, and several techniques to mitigate electron effects are demonstrated numerically.

  12. Electromigration in focused ion beam deposited tungsten single nanowires

    NASA Astrophysics Data System (ADS)

    Mandal, Pabitra; Das, Bipul; Raychaudhuri, A. K.

    As the focused ion beam induced deposited (FIBID) nanowires (NWs) of W, Pt are being used in nanoelectronic technology to connect individual nanodevices, repairing damaged interconnects in integrated circuit (IC), electromigration study in FIBID-NWs has become essential. Briefly, when a thin conductor, like metallic Al, Cu interconnects in an IC chip carry quite high current density ~1012 A/m2, ions or atoms start migrating. Such migration causes void and hillock formation leading to interconnect discontinuity, short circuit and ultimately IC failure. Our electromigration study in single FIBID-NWs of W reveals that failure in NWs of width and thickness ~100 nm occurs typically at 1011 A/m2. Most notably, void and hillock always form in opposite polarity compared to typical metallic NWs. Such distinctly new outcome is explained via electromigration driven by direct force (ionic charge*electric field) opposed to wind force driven migration observed in metallic NWs. As FIBID-NWs are composite in nature, different species (e.g., Ga, W and C) migrate with different degree and direction depending on their oxidation state, leading to redistribution of species across NW length and formation of a Ga rich hillock. S. N. Bose National Centre for Basic Sciences, Block-JD, Sector-III, Salt Lake, Kolkata-98, India.

  13. Wrinkled hard skins on polymers created by focused ion beam.

    PubMed

    Moon, Myoung-Woon; Lee, Sang Hoon; Sun, Jeong-Yun; Oh, Kyu Hwan; Vaziri, Ashkan; Hutchinson, John W

    2007-01-23

    A stiff skin forms on surface areas of a flat polydimethylsiloxane (PDMS) upon exposure to focused ion beam (FIB) leading to ordered surface wrinkles. By controlling the FIB fluence and area of exposure of the PDMS, one can create a variety of patterns in the wavelengths in the micrometer to submicrometer range, from simple one-dimensional wrinkles to peculiar and complex hierarchical nested wrinkles. Examination of the chemical composition of the exposed PDMS reveals that the stiff skin resembles amorphous silica. Moreover, upon formation, the stiff skin tends to expand in the direction perpendicular to the direction of ion beam irradiation. The consequent mismatch strain between the stiff skin and the PDMS substrate buckles the skin, forming the wrinkle patterns. The induced strains in the stiff skin are estimated by measuring the surface length in the buckled state. Estimates of the thickness and stiffness of the stiffened surface layer are estimated by using the theory for buckled films on compliant substrates. The method provides an effective and inexpensive technique to create wrinkled hard skin patterns on surfaces of polymers for various applications.

  14. Cryo-focused-ion-beam applications in structural biology.

    PubMed

    Rigort, Alexander; Plitzko, Jürgen M

    2015-09-01

    The ability to precisely control the preparation of biological samples for investigations by electron cryo-microscopy is becoming increasingly important for ultrastructural imaging in biology. Precision machining instruments such as the focused ion beam microscope (FIB) were originally developed for applications in materials science. However, today we witness a growing use of these tools in the life sciences mainly due to their versatility, since they can be used both as manipulation and as imaging devices, when complemented with a scanning electron microscope (SEM). The advent of cryo-preparation equipment and accessories made it possible to pursue work on frozen-hydrated biological specimens with these two beam (FIB/SEM) instruments. In structural biology, the cryo-FIB can be used to site-specifically thin vitrified specimens for transmission electron microscopy (TEM) and tomography. Having control over the specimen thickness is a decisive factor for TEM imaging, as the thickness of the object under scrutiny determines the attainable resolution. Besides its use for TEM preparation, the FIB/SEM microscope can be additionally used to obtain three-dimensional volumetric data from biological specimens. The unique combination of an imaging and precision manipulation tool allows sequentially removing material with the ion beam and imaging the milled block faces by scanning with the electron beam, an approach known as FIB/SEM tomography. This review covers both fields of cryo-FIB applications: specimen preparation for TEM cryo-tomography and volume imaging by cryo-FIB/SEM tomography.

  15. Focused ion beam fabrication of boron-doped diamond ultramicroelectrodes.

    PubMed

    Hu, Jingping; Holt, Katherine B; Foord, John S

    2009-07-15

    The fabrication of ultramicroelectrodes (UMEs) for analytical electrochemical applications has been explored, using boron-doped diamond as the active electrode material in an insulating coating formed by deposition of electrophoretic paint. Because of the rough nature of the diamond film, the property of such coatings that is normally exploited in the fabrication of UMEs, namely the tendency to retract automatically from sharp protrusions, cannot be used in the present instance. Instead focused ion beam (FIB) sputtering was employed to controllably produce UMEs with well-defined geometry, critical dimension of a few micrometers, and very thin insulating coatings. If the FIB machining is carried out at normal incidence to the diamond electrode surface, significant ion beam damage reduces the yield of successful electrodes. However, if a parallel machining geometry is employed, high yields of ultramicroelectrodes with a flat disk geometry can be obtained very reliably. The electrochemical properties of diamond UMEs are characterized. They show much lower background currents than the equivalent Pt or carbon fiber electrodes but more varied electrochemical response than macroscopic diamond electrodes. PMID:19545137

  16. High energy H- ion transport and stripping

    SciTech Connect

    Chou, W.; /Fermilab

    2005-05-01

    During the Proton Driver design study based on an 8 GeV superconducting RF H{sup -} linac, a major concern is the feasibility of transport and injection of high energy H{sup -} ions because the energy of H{sup -} beam would be an order of magnitude higher than the existing ones. This paper will focus on two key technical issues: (1) stripping losses during transport (including stripping by blackbody radiation, magnetic field and residual gases); (2) stripping efficiency of carbon foil during injection.

  17. Focus on networks, energy and the economy

    NASA Astrophysics Data System (ADS)

    Timme, Marc; Kocarev, Ljupco; Witthaut, Dirk

    2015-11-01

    A sustainable and reliable energy supply constitutes a fundamental prerequisite for the future of our society. The change to renewable sources comes with several systemic changes and includes, among others, smaller and more distributed producers as well as stronger and less predictable fluctuations. Parallel developments such as the transition from conventional producers and consumers to prosumers and the increasing number of electric vehicles add further complications. These changes require to extend and upgrade currently existing power grids. Yet precisely how to achieve an effective, robustly operating (electric) energy system is far from being understood. This focus issue aims to contribute to a number of these upcoming challenges from the perspective of self-organization and the collective nonlinear dynamics of power grids, interacting economic factors as well as technical restrictions and opportunities for distributed systems.

  18. Presidential candidates focus on energy policy

    SciTech Connect

    Lessard, P.; Belcher, J.

    1996-09-01

    When gasoline prices skyrocketed this past spring, sparking outcries from both the American public and lawmakers on Capitol Hill, the need for a national energy policy suddenly was pushed to the forefront. The attention the higher gasoline prices received has helped focus debate on an even more pressing issue-the real threat to the U.S. economy and national security when Americans cannot get enough oil, regardless of price, to fuel their industrial and transportation needs and, in some parts of the country, to heat their homes. While presidential candidates Bill Clinton and Bob Dole disagree with each other in many areas, with energy policy being no exception, both have expressed the opinion that the U.S. needs to be less reliant on foreign, and often unstable, countries for sources of fuel, such as oil. An exclusive interview with the candidates` respective campaigns about their views on issues facing the domestic oil and natural gas industry is presented.

  19. In situ mitigation of subsurface and peripheral focused ion beam damage via simultaneous pulsed laser heating

    DOE PAGES

    Stanford, Michael G.; Lewis, Brett B.; Iberi, Vighter O.; Fowlkes, Jason Davidson; Tan, Shida; Livengood, Rick; Rack, Philip D.

    2016-02-16

    Focused helium and neon ion (He(+)/Ne(+) ) beam processing has recently been used to push resolution limits of direct-write nanoscale synthesis. The ubiquitous insertion of focused He(+) /Ne(+) beams as the next-generation nanofabrication tool-of-choice is currently limited by deleterious subsurface and peripheral damage induced by the energetic ions in the underlying substrate. The in situ mitigation of subsurface damage induced by He(+)/Ne(+) ion exposures in silicon via a synchronized infrared pulsed laser-assisted process is demonstrated. The pulsed laser assist provides highly localized in situ photothermal energy which reduces the implantation and defect concentration by greater than 90%. The laser-assisted exposuremore » process is also shown to reduce peripheral defects in He(+) patterned graphene, which makes this process an attractive candidate for direct-write patterning of 2D materials. In conclusion, these results offer a necessary solution for the applicability of high-resolution direct-write nanoscale material processing via focused ion beams.« less

  20. In Situ Mitigation of Subsurface and Peripheral Focused Ion Beam Damage via Simultaneous Pulsed Laser Heating.

    PubMed

    Stanford, Michael G; Lewis, Brett B; Iberi, Vighter; Fowlkes, Jason D; Tan, Shida; Livengood, Rick; Rack, Philip D

    2016-04-01

    Focused helium and neon ion (He(+)/Ne(+)) beam processing has recently been used to push resolution limits of direct-write nanoscale synthesis. The ubiquitous insertion of focused He(+)/Ne(+) beams as the next-generation nanofabrication tool-of-choice is currently limited by deleterious subsurface and peripheral damage induced by the energetic ions in the underlying substrate. The in situ mitigation of subsurface damage induced by He(+)/Ne(+) ion exposures in silicon via a synchronized infrared pulsed laser-assisted process is demonstrated. The pulsed laser assist provides highly localized in situ photothermal energy which reduces the implantation and defect concentration by greater than 90%. The laser-assisted exposure process is also shown to reduce peripheral defects in He(+) patterned graphene, which makes this process an attractive candidate for direct-write patterning of 2D materials. These results offer a necessary solution for the applicability of high-resolution direct-write nanoscale material processing via focused ion beams. PMID:26864147

  1. In Situ Mitigation of Subsurface and Peripheral Focused Ion Beam Damage via Simultaneous Pulsed Laser Heating.

    PubMed

    Stanford, Michael G; Lewis, Brett B; Iberi, Vighter; Fowlkes, Jason D; Tan, Shida; Livengood, Rick; Rack, Philip D

    2016-04-01

    Focused helium and neon ion (He(+)/Ne(+)) beam processing has recently been used to push resolution limits of direct-write nanoscale synthesis. The ubiquitous insertion of focused He(+)/Ne(+) beams as the next-generation nanofabrication tool-of-choice is currently limited by deleterious subsurface and peripheral damage induced by the energetic ions in the underlying substrate. The in situ mitigation of subsurface damage induced by He(+)/Ne(+) ion exposures in silicon via a synchronized infrared pulsed laser-assisted process is demonstrated. The pulsed laser assist provides highly localized in situ photothermal energy which reduces the implantation and defect concentration by greater than 90%. The laser-assisted exposure process is also shown to reduce peripheral defects in He(+) patterned graphene, which makes this process an attractive candidate for direct-write patterning of 2D materials. These results offer a necessary solution for the applicability of high-resolution direct-write nanoscale material processing via focused ion beams.

  2. Atomic force microscope cantilever calibration using a focused ion beam.

    PubMed

    Slattery, Ashley D; Quinton, Jamie S; Gibson, Christopher T

    2012-07-20

    A calibration method is presented for determining the spring constant of atomic force microscope (AFM) cantilevers, which is a modification of the established Cleveland added mass technique. A focused ion beam (FIB) is used to remove a well-defined volume from a cantilever with known density, substantially reducing the uncertainty usually present in the added mass method. The technique can be applied to any type of AFM cantilever; but for the lowest uncertainty it is best applied to silicon cantilevers with spring constants above 0.7 N m(-1), where uncertainty is demonstrated to be typically between 7 and 10%. Despite the removal of mass from the cantilever, the calibration method presented does not impair the probes' ability to acquire data. The technique has been extensively tested in order to verify the underlying assumptions in the method. This method was compared to a number of other calibration methods and practical improvements to some of these techniques were developed, as well as important insights into the behavior of FIB modified cantilevers. These results will prove useful to research groups concerned with the application of microcantilevers to nanoscience, in particular for cases where maintaining pristine AFM tip condition is critical.

  3. Insight into Emiliania huxleyi coccospheres by focused ion beam sectioning

    NASA Astrophysics Data System (ADS)

    Hoffmann, R.; Kirchlechner, C.; Langer, G.; Wochnik, A. S.; Griesshaber, E.; Schmahl, W. W.; Scheu, C.

    2015-02-01

    Coccospheres of a cultured Emiliania huxleyi clone were sampled in the exponential growth phase and sectioned using a focused ion beam microscope. An average of 69 sections and the corresponding secondary electron micrographs per coccosphere provided detailed information on coccosphere architecture. The coccospheres feature 2-3 layers on average and 20 coccoliths per cell, of which only 15 can be seen in conventional scanning electron micrographs. The outer coccosphere diameter was positively correlated with the number of coccolith layers. By contrast, the inner coccosphere diameter (around 4.36 μm), and hence the cell diameter, was quasi-constant. Coccoliths were not evenly distributed across the coccosphere, resulting more often than not in one part of the coccosphere displaying more coccolith layers than the other. The architectural data allowed for the calculation of the PIC / POC ratio, the density and the sinking velocity of individual cells. The correlation of these parameters has implications for the ongoing debate on the function of coccoliths.

  4. Optical fiber tip templating using direct focused ion beam milling

    PubMed Central

    Micco, A.; Ricciardi, A.; Pisco, M.; La Ferrara, V.; Cusano, A.

    2015-01-01

    We report on a method for integrating sub-wavelength resonant structures on top of optical fiber tip. Our fabrication technique is based on direct milling of the glass on the fiber facet by means of focused ion beam. The patterned fiber tip acts as a structured template for successive depositions of any responsive or functional overlay. The proposed method is validated by depositing on the patterned fiber a high refractive index material layer, to obtain a ‘double-layer’ photonic crystal slab supporting guided resonances, appearing as peaks in the reflection spectrum. Morphological and optical characterizations are performed to investigate the effects of the fabrication process. Our results show how undesired effects, intrinsic to the fabrication procedure should be taken into account in order to guarantee a successful development of the device. Moreover, to demonstrate the flexibility of our approach and the possibility to engineering the resonances, a thin layer of gold is also deposited on the fiber tip, giving rise to a hybrid photonic-plasmonic structure with a complementary spectral response and different optical field distribution at the resonant wavelengths. Overall, this work represents a significant step forward the consolidation of Lab-on-Fiber Technology. PMID:26531887

  5. Simulating Electron Clouds in High-Current Ion Accelerators withSolenoid Focusing

    SciTech Connect

    Sharp, W.M.; Grote, D.P.; Cohen, R.H.; Friedman, A.; Vay, J.-L.; Seidl, P.A.; Roy, P.K.; Coleman, J.E.; Armijo, J.; Haber, I.

    2006-09-20

    Contamination from electrons is a concern for the solenoid-focused ion accelerators being developed for experiments in high-energy-density physics (HEDP). These electrons are produced directly by beam ions hitting lattice elements and intercepting diagnostics, or indirectly by ionization of desorbed neutral gas, and they are believed responsible for time dependence of the beam radius, emittance, and focal distance seen on the Solenoid Transport Experiment (STX) at Lawrence Berkeley National Laboratory. The electrostatic particle-in-cell code WARP has been upgraded to included the physics needed to simulate electron-cloud phenomena. We present preliminary self-consistent simulations of STX experiments suggesting that the observed time dependence of the beam stems from a complicated interaction of beam ions, desorbed neutrals, and electrons.

  6. Simulating Electron Clouds in High-Current Ion Accelerators with Solenoid Focusing

    SciTech Connect

    Sharp, W; Grote, D; Cohen, R; Friedman, A; Vay, J; Seidl, P; Roy, P; Coleman, J; Armijo, J; Haber, I

    2006-08-15

    Contamination from electrons is a concern for the solenoid-focused ion accelerators being developed for experiments in high-energy-density physics (HEDP). These electrons are produced directly by beam ions hitting lattice elements and intercepting diagnostics, or indirectly by ionization of desorbed neutral gas, and they are believed responsible for time dependence of the beam radius, emittance, and focal distance seen on the Solenoid Transport Experiment (STX) at Lawrence Berkeley National Laboratory. The electrostatic particle-in-cell code WARP has been upgraded to included the physics needed to simulate electron-cloud phenomena. We present preliminary self-consistent simulations of STX experiments suggesting that the observed time dependence of the beam stems from a complicated interaction of beam ions, desorbed neutrals, and electrons.

  7. Simulating Electron Effects in Heavy-Ion Accelerators with Solenoid Focusing

    SciTech Connect

    Sharp, W M; Grote, D P; Cohen, R H; Friedman, A; Molvik, A W; Vay, J; Seidl, P; Roy, P K; Coleman, J E; Haber, I

    2007-06-29

    Contamination from electrons is a concern for solenoid-focused ion accelerators being developed for experiments in high-energy-density physics. These electrons, produced directly by beam ions hitting lattice elements or indirectly by ionization of desorbed neutral gas, can potentially alter the beam dynamics, leading to a time-varying focal spot, increased emittance, halo, and possibly electron-ion instabilities. The electrostatic particle-in-cell code WARP is used to simulate electron-cloud studies on the solenoid-transport experiment (STX) at Lawrence Berkeley National Laboratory. We present self-consistent simulations of several STX configurations and compare the results with experimental data in order to calibrate physics parameters in the model.

  8. Simulating Electron Effects in Heavy-Ion Accelerators with Solenoid Focusing

    SciTech Connect

    Sharp, W. M.; Grote, D. P.; Cohen, R. H.; Friedman, A.; Molvik, A. W.; Vay, J.-L.; Seidl, P. A.; Roy, P. K.; Coleman, J. E.; Haber, I.

    2007-06-20

    Contamination from electrons is a concern for solenoid-focused ion accelerators being developed for experiments in high-energy-density physics. These electrons, produced directly by beam ions hitting lattice elements or indirectly by ionization of desorbed neutral gas, can potentially alter the beam dynamics, leading to a time-varying focal spot, increased emittance, halo, and possibly electron-ion instabilities. The electrostatic particle-in-cell code WARP is used to simulate electron-cloud studies on the solenoid-transport experiment (STX) at Lawrence Berkeley National Laboratory. We present self-consistent simulations of several STX configurations and compare the results with experimental data in order to calibrate physics parameters in the model.

  9. Simulating electron clouds in high-current ion accelerators with solenoid focusing

    NASA Astrophysics Data System (ADS)

    Sharp, W. M.; Grote, D. P.; Cohen, R. H.; Friedman, A.; Vay, J.-L.; Seidl, P. A.; Roy, P. K.; Coleman, J. E.; Armijo, J.; Haber, I.

    2007-07-01

    Contamination from electrons is a concern for the solenoid-focused ion accelerators being developed for experiments in high-energy density physics (HEDP). These electrons are produced directly by beam ions hitting lattice elements and intercepting diagnostics, or indirectly by ionization of desorbed neutral gas, and they are believed responsible for time dependence of the beam radius, emittance, and focal distance seen on the solenoid transport experiment (STX) at Lawrence Berkeley National Laboratory. The electrostatic particle-in-cell code WARP has been upgraded to include the physics needed to simulate electron-cloud phenomena. We present preliminary self-consistent simulations of STX experiments suggesting that the observed time dependence of the beam stems from a complicated interaction of beam ions, desorbed neutrals, and electrons.

  10. An investigation on focused electron/ion beam induced degradation mechanisms of conjugated polymers.

    PubMed

    Sezen, Meltem; Plank, Harald; Fisslthaler, Evelin; Chernev, Boril; Zankel, Armin; Tchernychova, Elena; Blümel, Alexander; List, Emil J W; Grogger, Werner; Pölt, Peter

    2011-12-01

    Irradiation damage, caused by the use of beams in the electron microscopes, leads to undesired physical/chemical material property changes or uncontrollable modification of structures that are being processed. Particularly, soft matter such as polymers or biological materials is highly susceptible and very much prone to react on irradiation by electron and ion beams. The effect is even higher when materials are subjected to energetic species such as ions that possess high momentum and relatively low mean path due to their mass. Especially when Ga(+) ions (used as the ion source in Focused Ion Beam (FIB) instruments) are considered, the end-effect might even be the total loss of the material's properties. This paper will discuss the possible types of degradation mechanisms and defect formations that can take place during ion and electron beam irradiation of the conjugated polymers: e.g. polyfluorene (PF) and poly-3-hexylthiophene (P3HT) thin films. For the investigation of the irradiation induced degradation mechanisms in this study, complementary analytical techniques such as Raman Spectroscopy (RS), Infrared Spectroscopy (IR), Electron Energy Loss Spectroscopy (EELS), Atomic Force Microscopy (AFM), and Fluorescence Microscopy including Photoluminescence (PL) and Electroluminescence (EL) Microscopy were applied.

  11. An investigation on focused electron/ion beam induced degradation mechanisms of conjugated polymers.

    PubMed

    Sezen, Meltem; Plank, Harald; Fisslthaler, Evelin; Chernev, Boril; Zankel, Armin; Tchernychova, Elena; Blümel, Alexander; List, Emil J W; Grogger, Werner; Pölt, Peter

    2011-12-01

    Irradiation damage, caused by the use of beams in the electron microscopes, leads to undesired physical/chemical material property changes or uncontrollable modification of structures that are being processed. Particularly, soft matter such as polymers or biological materials is highly susceptible and very much prone to react on irradiation by electron and ion beams. The effect is even higher when materials are subjected to energetic species such as ions that possess high momentum and relatively low mean path due to their mass. Especially when Ga(+) ions (used as the ion source in Focused Ion Beam (FIB) instruments) are considered, the end-effect might even be the total loss of the material's properties. This paper will discuss the possible types of degradation mechanisms and defect formations that can take place during ion and electron beam irradiation of the conjugated polymers: e.g. polyfluorene (PF) and poly-3-hexylthiophene (P3HT) thin films. For the investigation of the irradiation induced degradation mechanisms in this study, complementary analytical techniques such as Raman Spectroscopy (RS), Infrared Spectroscopy (IR), Electron Energy Loss Spectroscopy (EELS), Atomic Force Microscopy (AFM), and Fluorescence Microscopy including Photoluminescence (PL) and Electroluminescence (EL) Microscopy were applied. PMID:21993473

  12. Thomson parabola ion energy analyzer

    SciTech Connect

    Cobble, James A; Flippo, Kirk A; Letzring, Samuel A; Lopez, Frank E; Offermann, Dustin T; Oertel, John A; Mastrosimone, Dino

    2010-01-01

    A new, versatile Thomson parabola ion energy (TPIE) analyzer has been designed and constructed for use at the OMEGA-EP facility. Multi-MeV ions from EP targets are transmitted through a W pinhole into a (5- or 8-kG) magnetic field and subsequently through a parallel electric field of up to 30 kV/cm. The ion drift region may have a user-selected length of 10, 50, or 80 cm. With the highest fields, 500-Me V C{sup 6+} and C{sup 5+} may be resolved. TPIE is TIM-mounted at OMEGA-EP and is qualified in all existing TIMs. The instrument runs on pressure-interlocked 15-VDC power available in EP TIM carts. It may be inserted to within several inches of the target to attain sufficient flux for a measurement. For additional flux control, the user may select a square-aperture W pinhole of 0.004-inch or 0.010-inch. The detector consists of CR-39 backed by an image plate. The fully relativistic design code and design features are discussed. Ion spectral results from first use at OMEGA-EP are expected.

  13. A Superconducting Solenoid for Heavy Ion Beam Focusing

    NASA Astrophysics Data System (ADS)

    Kim, J. W.; Kubo, Toshiyuki; Kawaguchi, Takeo; Imai, Yoshio; Minato, Tsuneaki; Seo, Kazutaka

    1997-05-01

    A superconducting solenoid has been constructed to use as a final focusing element at the entrance of the projectile fragment separator RIPS (T. Kubo et al, Nucl. Instr. & Meth. B70 (1992) 309) at RIKEN. The design field on axis is 6 tesla, the average current density being 9,600 A/cm^2. The overall coil length is 1.1 meter, and the coil is divided into three sections of equal length to ease winding and possibly to distribute the stored energy. A major feature of the magnet is that cooling is conductive without LHe involved, using a cryocooler directly attached onto the coil. The solenoid is currently being tested, and the test results will be presented. After magnet testing, the solenoid will be installed in the beamline. The results of beam experiment will also be presented, along with calculation results with TRANSPORT.

  14. The prospects of a subnanometer focused neon ion beam.

    PubMed

    Rahman, F H M; McVey, Shawn; Farkas, Louis; Notte, John A; Tan, Shida; Livengood, Richard H

    2012-01-01

    The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various candidate ion beams and their technical prospects suggest that a neon beam might be the most readily achieved. Such a neon beam would provide a sputtering yield that exceeds helium by an order of magnitude while still offering a theoretical probe size less than 1-nm. This article outlines the motivation for a neon gas field ion source, the expected performance through simulations, and provides an update of our experimental progress. PMID:21796647

  15. The prospects of a subnanometer focused neon ion beam.

    PubMed

    Rahman, F H M; McVey, Shawn; Farkas, Louis; Notte, John A; Tan, Shida; Livengood, Richard H

    2012-01-01

    The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various candidate ion beams and their technical prospects suggest that a neon beam might be the most readily achieved. Such a neon beam would provide a sputtering yield that exceeds helium by an order of magnitude while still offering a theoretical probe size less than 1-nm. This article outlines the motivation for a neon gas field ion source, the expected performance through simulations, and provides an update of our experimental progress.

  16. Molecular ion sources for low energy semiconductor ion implantation (invited)

    NASA Astrophysics Data System (ADS)

    Hershcovitch, A.; Gushenets, V. I.; Seleznev, D. N.; Bugaev, A. S.; Dugin, S.; Oks, E. M.; Kulevoy, T. V.; Alexeyenko, O.; Kozlov, A.; Kropachev, G. N.; Kuibeda, R. P.; Minaev, S.; Vizir, A.; Yushkov, G. Yu.

    2016-02-01

    Smaller semiconductors require shallow, low energy ion implantation, resulting space charge effects, which reduced beam currents and production rates. To increase production rates, molecular ions are used. Boron and phosphorous (or arsenic) implantation is needed for P-type and N-type semiconductors, respectively. Carborane, which is the most stable molecular boron ion leaves unacceptable carbon residue on extraction grids. A self-cleaning carborane acid compound (C4H12B10O4) was synthesized and utilized in the ITEP Bernas ion source resulting in large carborane ion output, without carbon residue. Pure gaseous processes are desired to enable rapid switch among ion species. Molecular phosphorous was generated by introducing phosphine in dissociators via 4PH3 = P4 + 6H2; generated molecular phosphorous in a pure gaseous process was then injected into the HCEI Calutron-Bernas ion source, from which P4+ ion beams were extracted. Results from devices and some additional concepts are described.

  17. Molecular ion sources for low energy semiconductor ion implantation (invited).

    PubMed

    Hershcovitch, A; Gushenets, V I; Seleznev, D N; Bugaev, A S; Dugin, S; Oks, E M; Kulevoy, T V; Alexeyenko, O; Kozlov, A; Kropachev, G N; Kuibeda, R P; Minaev, S; Vizir, A; Yushkov, G Yu

    2016-02-01

    Smaller semiconductors require shallow, low energy ion implantation, resulting space charge effects, which reduced beam currents and production rates. To increase production rates, molecular ions are used. Boron and phosphorous (or arsenic) implantation is needed for P-type and N-type semiconductors, respectively. Carborane, which is the most stable molecular boron ion leaves unacceptable carbon residue on extraction grids. A self-cleaning carborane acid compound (C4H12B10O4) was synthesized and utilized in the ITEP Bernas ion source resulting in large carborane ion output, without carbon residue. Pure gaseous processes are desired to enable rapid switch among ion species. Molecular phosphorous was generated by introducing phosphine in dissociators via 4PH3 = P4 + 6H2; generated molecular phosphorous in a pure gaseous process was then injected into the HCEI Calutron-Bernas ion source, from which P4(+) ion beams were extracted. Results from devices and some additional concepts are described.

  18. Ion probe beam experiments and kinetic modeling in a dense plasma focus Z-pinch

    SciTech Connect

    Schmidt, A. Ellsworth, J. Falabella, S. Link, A. McLean, H. Rusnak, B. Sears, J. Tang, V.; Welch, D.

    2014-12-15

    The Z-pinch phase of a dense plasma focus (DPF) emits multiple-MeV ions in a ∼cm length. The mechanisms through which these physically simple devices generate such high energy beams in a relatively short distance are not fully understood. We are exploring the origins of these large gradients using measurements of an ion probe beam injected into a DPF during the pinch phase and the first kinetic simulations of a DPF Z-pinch. To probe the accelerating fields in our table top experiment, we inject a 4 MeV deuteron beam along the z-axis and then sample the beam energy distribution after it passes through the pinch region. Using this technique, we have directly measured for the first time the acceleration of an injected ion beam. Our particle-in-cell simulations have been benchmarked on both a kJ-scale DPF and a MJ-scale DPF. They have reproduced experimentally measured neutron yields as well as ion beams and EM oscillations which fluid simulations do not exhibit. Direct comparisons between the experiment and simulations enhance our understanding of these plasmas and provide predictive design capability for accelerator and neutron source applications.

  19. Ion probe beam experiments and kinetic modeling in a dense plasma focus Z-pinch

    NASA Astrophysics Data System (ADS)

    Schmidt, A.; Ellsworth, J.; Falabella, S.; Link, A.; McLean, H.; Rusnak, B.; Sears, J.; Tang, V.; Welch, D.

    2014-12-01

    The Z-pinch phase of a dense plasma focus (DPF) emits multiple-MeV ions in a ˜cm length. The mechanisms through which these physically simple devices generate such high energy beams in a relatively short distance are not fully understood. We are exploring the origins of these large gradients using measurements of an ion probe beam injected into a DPF during the pinch phase and the first kinetic simulations of a DPF Z-pinch. To probe the accelerating fields in our table top experiment, we inject a 4 MeV deuteron beam along the z-axis and then sample the beam energy distribution after it passes through the pinch region. Using this technique, we have directly measured for the first time the acceleration of an injected ion beam. Our particle-in-cell simulations have been benchmarked on both a kJ-scale DPF and a MJ-scale DPF. They have reproduced experimentally measured neutron yields as well as ion beams and EM oscillations which fluid simulations do not exhibit. Direct comparisons between the experiment and simulations enhance our understanding of these plasmas and provide predictive design capability for accelerator and neutron source applications.

  20. An electrostatic ion guide for efficient transmission of low energy externally formed ions into a Fourier transform ion cyclotron resonance mass spectrometer

    NASA Astrophysics Data System (ADS)

    Limbach, Patrick A.; Marshall, Alan G.; Wang, Mingda

    1993-06-01

    A new method for transmitting externally formed ions into an ICR ion trap is demonstrated. In an electrostatic ion guide, a potential difference is applied between a conductive cylinder and a rigid wire suspended along the central axis of the cylinder. The cylinder is then positioned between an ion source located outside the bore of superconducting solenoidal magnet and an ion trap located at or near the center of the solenoid. simion simulations predict that low-energy ions entering the ion guide will spiral around the central wire and pass through the fringe of the magnet to reach the ICR ion trap. The theoretical predictions are borne out by experiments in which Na+ and K+ ions from a thermionic emitter are transmitted with high efficiency through the fringe field of the magnet to the ICR ion trap. Mass resolving power of 285 000 for K+ is shown. The electrostatic ion guide offers the advantages that: (a) a wide range of low-energy external sources (e.g., fast-atom on fast-ion bombardment, electrospray, glow discharge, etc.) may be used; (b) prior acceleration of the ions along the magnetic field direction (and subsequent deceleration to slow the ions on entry into the ICR ion trap) is not required; (c) ions are focused along magnetic field lines once the ions have passed through the magnetic fringe field; and (d) ions formed initially off axis are efficiently captured and transmitted by the ion guide without additional focusing.

  1. Room temperature operational single electron transistor fabricated by focused ion beam deposition

    NASA Astrophysics Data System (ADS)

    Karre, P. Santosh Kumar; Bergstrom, Paul L.; Mallick, Govind; Karna, Shashi P.

    2007-07-01

    We present the fabrication and room temperature operation of single electron transistors using 8nm tungsten islands deposited by focused ion beam deposition technique. The tunnel junctions are fabricated using oxidation of tungsten in peracetic acid. Clear Coulomb oscillations, showing charging and discharging of the nanoislands, are seen at room temperature. The device consists of an array of tunnel junctions; the tunnel resistance of individual tunnel junction of the device is calculated to be as high as 25.13GΩ. The effective capacitance of the array of tunnel junctions was found to be 0.499aF, giving a charging energy of 160.6meV.

  2. Rechargeable dual-metal-ion batteries for advanced energy storage.

    PubMed

    Yao, Hu-Rong; You, Ya; Yin, Ya-Xia; Wan, Li-Jun; Guo, Yu-Guo

    2016-04-14

    Energy storage devices are more important today than any time before in human history due to the increasing demand for clean and sustainable energy. Rechargeable batteries are emerging as the most efficient energy storage technology for a wide range of portable devices, grids and electronic vehicles. Future generations of batteries are required to have high gravimetric and volumetric energy, high power density, low price, long cycle life, high safety and low self-discharge properties. However, it is quite challenging to achieve the above properties simultaneously in state-of-the-art single metal ion batteries (e.g. Li-ion batteries, Na-ion batteries and Mg-ion batteries). In this contribution, hybrid-ion batteries in which various metal ions simultaneously engage to store energy are shown to provide a new perspective towards advanced energy storage: by connecting the respective advantages of different metal ion batteries they have recently attracted widespread attention due to their novel performances. The properties of hybrid-ion batteries are not simply the superposition of the performances of single ion batteries. To enable a distinct description, we only focus on dual-metal-ion batteries in this article, for which the design and the benefits are briefly discussed. We enumerate some new results about dual-metal-ion batteries and demonstrate the mechanism for improving performance based on knowledge from the literature and experiments. Although the search for hybrid-ion batteries is still at an early age, we believe that this strategy would be an excellent choice for breaking the inherent disadvantages of single ion batteries in the near future.

  3. Ion sources for energy extremes of ion implantation.

    PubMed

    Hershcovitch, A; Johnson, B M; Batalin, V A; Kropachev, G N; Kuibeda, R P; Kulevoy, T V; Kolomiets, A A; Pershin, V I; Petrenko, S V; Rudskoy, I; Seleznev, D N; Bugaev, A S; Gushenets, V I; Litovko, I V; Oks, E M; Yushkov, G Yu; Masunov, E S; Polozov, S M; Poole, H J; Storozhenko, P A; Svarovski, A Ya

    2008-02-01

    For the past four years a joint research and development effort designed to develop steady state, intense ion sources has been in progress with the ultimate goal to develop ion sources and techniques that meet the two energy extreme range needs of meV and hundreads of eV ion implanters. This endeavor has already resulted in record steady state output currents of high charge state of antimony and phosphorus ions: P(2+) [8.6 pmA (particle milliampere)], P(3+) (1.9 pmA), and P(4+) (0.12 pmA) and 16.2, 7.6, 3.3, and 2.2 pmA of Sb(3+)Sb(4+), Sb(5+), and Sb(6+) respectively. For low energy ion implantation, our efforts involve molecular ions and a novel plasmaless/gasless deceleration method. To date, 1 emA (electrical milliampere) of positive decaborane ions was extracted at 10 keV and smaller currents of negative decaborane ions were also extracted. Additionally, boron current fraction of over 70% was extracted from a Bernas-Calutron ion source, which represents a factor of 3.5 improvement over currently employed ion sources.

  4. ION SOURCES FOR ENERGY EXTREMES OF ION IMPLANTATION.

    SciTech Connect

    HERSCHCOVITCH,A.; JOHNSON, B.M.; BATALIN, V.A.; KROPACHEV, G.N.; KUIBEDA, R.P.; KULEVOY, T.V.; KOLOMIETS, A.A.; PERSHIN, V.I.; PETRENKO, S.V.; RUDSKOY, I.; SELEZNEV, D.N.; BUGAEV, A.S.; GUSHENETS, V.I.; LITOVKO, I.V.; OKS, E.M.; YUSHKOV, G. YU.; MASEUNOV, E.S.; POLOZOV, S.M.; POOLE, H.J.; STOROZHENKO, P.A.; SVAROVSKI, YA.

    2007-08-26

    For the past four years a joint research and development effort designed to develop steady state, intense ion sources has been in progress with the ultimate goal to develop ion sources and techniques, which meet the two energy extreme range needs of mega-electron-volt and 100's of electron-volt ion implanters. This endeavor has already resulted in record steady state output currents of high charge state of Antimony and Phosphorous ions: P{sup 2+} (8.6 pmA), P{sup 3+} (1.9 pmA), and P{sup 4+} (0.12 pmA) and 16.2, 7.6, 3.3, and 2.2 pmA of Sb{sup 3+} Sb{sup 4+}, Sb{sup 5+}, and Sb{sup 6+} respectively. For low energy ion implantation our efforts involve molecular ions and a novel plasmaless/gasless deceleration method. To date, 1 emA of positive Decaborane ions were extracted at 10 keV and smaller currents of negative Decaborane ions were also extracted. Additionally, Boron current fraction of over 70% was extracted from a Bemas-Calutron ion source, which represents a factor of 3.5 improvement over currently employed ion sources.

  5. Neutral beamline with improved ion energy recovery

    DOEpatents

    Dagenhart, William K.; Haselton, Halsey H.; Stirling, William L.; Whealton, John H.

    1984-01-01

    A neutral beamline generator with unneutralized ion energy recovery is provided which enhances the energy recovery of the full energy ion component of the beam exiting the neutralizer cell of the beamline. The unneutralized full energy ions exiting the neutralizer are deflected from the beam path and the electrons in the cell are blocked by a magnetic field applied transverse to the beamline in the cell exit region. The ions, which are generated at essentially ground potential and accelerated through the neutralizer cell by a negative acceleration voltage, are collected at ground potential. A neutralizer cell exit end region is provided which allows the magnetic and electric fields acting on the exiting ions to be closely coupled. As a result, the fractional energy ions exiting the cell with the full energy ions are reflected back into the gas cell. Thus, the fractional energy ions do not detract from the energy recovery efficiency of full energy ions exiting the cell which can reach the ground potential interior surfaces of the beamline housing.

  6. Neutral beamline with improved ion energy recovery

    DOEpatents

    Kim, Jinchoon

    1984-01-01

    A neutral beamline employing direct energy recovery of unneutralized residual ions is provided which enhances the energy recovery of the full energy ion component of the beam exiting the neutralizer cell, and thus improves the overall neutral beamline efficiency. The unneutralized full energy ions exiting the neutralizer are deflected from the beam path and the electrons in the cell are blocked by a magnetic field applied transverse to the beam direction in the neutral izer exit region. The ions which are generated at essentially ground potential and accelerated through the neutralizer cell by a negative acceleration voltage are collected at ground potential. A neutralizer cell exit end region is provided which allows the magnetic and electric fields acting on the exiting ions to be loosely coupled. As a result, the fractional energy ions exiting the cell are reflected onto and collected at an interior wall of the neutralizer formed by the modified end geometry, and thus do not detract from the energy recovery efficiency of full energy ions exiting the cell. Electrons within the neutralizer are prevented from exiting the neutralizer end opening by the action of crossed fields drift (ExB) and are terminated to a collector collar around the downstream opening of the neutralizer. The correct combination of the extended neutralizer end structure and the magnet region is designed so as to maximize the exit of full energy ions and to contain the fractional energy ions.

  7. Monte Carlo simulations of nanoscale focused neon ion beam sputtering of copper: elucidating resolution limits and sub-surface damage

    NASA Astrophysics Data System (ADS)

    Timilsina, R.; Tan, S.; Livengood, R.; Rack, P. D.

    2014-12-01

    A three dimensional Monte Carlo simulation program was developed to model physical sputtering and to emulate vias nanomachined by the gas field ion microscope. Experimental and simulation results of focused neon ion beam induced sputtering of copper are presented and compared to previously published experiments. The simulation elucidates the nanostructure evolution during the physical sputtering of high aspect ratio nanoscale features. Quantitative information such as the energy-dependent sputtering yields, dose dependent aspect ratios, and resolution-limiting effects are discussed. Furthermore, the nuclear energy loss and implant concentration beneath the etch front is correlated with the sub-surface damage revealed by transmission electron microscopy at different beam energies.

  8. Monte Carlo simulations of nanoscale focused neon ion beam sputtering of copper: elucidating resolution limits and sub-surface damage.

    PubMed

    Timilsina, R; Tan, S; Livengood, R; Rack, P D

    2014-12-01

    A three dimensional Monte Carlo simulation program was developed to model physical sputtering and to emulate vias nanomachined by the gas field ion microscope. Experimental and simulation results of focused neon ion beam induced sputtering of copper are presented and compared to previously published experiments. The simulation elucidates the nanostructure evolution during the physical sputtering of high aspect ratio nanoscale features. Quantitative information such as the energy-dependent sputtering yields, dose dependent aspect ratios, and resolution-limiting effects are discussed. Furthermore, the nuclear energy loss and implant concentration beneath the etch front is correlated with the sub-surface damage revealed by transmission electron microscopy at different beam energies.

  9. Monte Carlo simulations of nanoscale focused neon ion beam sputtering of copper: elucidating resolution limits and sub-surface damage.

    PubMed

    Timilsina, R; Tan, S; Livengood, R; Rack, P D

    2014-12-01

    A three dimensional Monte Carlo simulation program was developed to model physical sputtering and to emulate vias nanomachined by the gas field ion microscope. Experimental and simulation results of focused neon ion beam induced sputtering of copper are presented and compared to previously published experiments. The simulation elucidates the nanostructure evolution during the physical sputtering of high aspect ratio nanoscale features. Quantitative information such as the energy-dependent sputtering yields, dose dependent aspect ratios, and resolution-limiting effects are discussed. Furthermore, the nuclear energy loss and implant concentration beneath the etch front is correlated with the sub-surface damage revealed by transmission electron microscopy at different beam energies. PMID:25387461

  10. Formation of metallic nanostructures on the surface of ion- exchange glass by focused electron beam

    NASA Astrophysics Data System (ADS)

    Komissarenko, F. E.; Zhukov, M. V.; Mukhin, I. S.; Golubok, A. O.; Sidorov, A. I.

    2015-11-01

    This paper presents a new method for formation of metallic nanostructures on the surface of ion-exchange glass. The method is based on the interaction of a focused electron beam with ions in ion-exchange glass. In experiments nanostructures with different shapes were obtained, depending on the electrons irradiation conditions.

  11. Ionization, ion distribution, and ion focusing in laser plasmas from atomic and diatomic targets

    SciTech Connect

    Srivastava, S. N.; Rohr, K.; Sinha, B. K.

    2006-04-01

    Charge-resolved measurements of the total number of particles from plasmas produced from planar, monoatomic targets of copper and tungsten as well as the binary targets of copper and tungsten are reported, using a 125 mJ, 5 ns, Nd:YAG laser, at a laser intensity of about 10{sup 10} W/cm{sup 2}. The measurements show a severe quenching of the ionization states in the case of the diatomic targets. These measurements and their variations with ionization state support the theoretical investigations of plasma motion under the influence of the viscous force in case of plasmas consisting of light and heavy particles. Gaussian width measurements of the angular particle distribution showed a focusing effect towards the target normal, the width decreasing as the ion mass and ionization state increased. From the analysis of the theoretical results on self-similarity expansion it is concluded that the ion acceleration due to the built-in electrostatic potential is not significant.

  12. High resolution energy analyzer for broad ion beam characterization

    SciTech Connect

    Kanarov, V.; Hayes, A.; Yevtukhov, R.; Siegfried, D.; Sferlazzo, P.

    2008-09-15

    Characterization of the ion energy distribution function (IEDF) of low energy high current density ion beams by conventional retarding field and deflection type energy analyzers is limited due to finite ion beam emittance and beam space charge spreading inside the analyzer. These deficiencies are, to a large extent, overcome with the recent development of the variable-focusing retarding field energy analyzer (RFEA), which has a cylindrical focusing electrode preceding the planar retarding grid. The principal concept of this analyzer is conversion of a divergent charged particle beam into a quasiparallel beam before analyzing it by the planar retarding field. This allows analysis of the beam particle total kinetic energy distribution with greatly improved energy resolution. Whereas this concept was first applied to analyze 5-10 keV pulsed electron beams, the present authors have adapted it to analyze the energy distribution of a low energy ({<=}1 KeV) broad ion beam. In this paper we describe the RFEA design, which was modified from the original, mainly as required by the specifics of broad ion beam energy analysis, and the device experimental characterization and modeling results. Among the modifications, an orifice electrode placed in front of the RFEA provides better spatial resolution of the broad ion beam ion optics emission region and reduces the beam plasma density in the vicinity of analyzer entry. An electron repeller grid placed in front of the RFEA collector was found critical for suppressing secondary electrons, both those incoming to the collector and those released from its surface, and improved energy spectrum measurement repeatability and accuracy. The use of finer mesh single- and double-grid retarding structures reduces the retarding grid lens effect and improves the analyzer energy resolution and accuracy of the measured spectrum mean energy. However, additional analyzer component and configuration improvements did not further change the analyzed

  13. Effective removal of Ga residue from focused ion beam using a plasma cleaner.

    PubMed

    Ko, Dong-Su; Park, Young Min; Kim, Sung-Dae; Kim, Young-Woon

    2007-01-01

    Samples prepared using the focused ion beam (FIB) inevitably contain the surface damage induced by energetic Ga+ ions. An effective method of removing the surface damage is demonstrated using a plasma cleaner, a device which is widely used to minimize the surface contamination in scanning transmission electron microscopy (STEM). Surface bombardment with low-energy Ar+ ions was induced by biasing the sample immersed in the plasma source, so as to etch off the surface materials. The etch rates of SiO2, measured with a bias voltage of 100-300 V, were found to vary linearly with both the time and bias and were able to be controlled from 1.4 to 9 nm/min. The removal of the Ga residue was confirmed using energy dispersive spectroscopy (EDS) after the plasma processing of the FIB-prepared sample. When the FIB-prepared sample was processed via plasma etching for 10 min with a bias of 150 V, the surface Ga damage was completely removed.

  14. Focus On: Energy Conservation Practices in Schools.

    ERIC Educational Resources Information Center

    Massachusetts State Dept. of Education, Boston.

    This pamphlet briefly describes 23 effective energy conservation programs in Massachusetts schools today. These practices range from changes in classroom lighting fixtures to complete heating system redesign. Each program represents an effort by school systems to adapt to changing energy needs and available resources. Each entry describes the…

  15. Compact surface plasma H- ion source with geometrical focusing

    NASA Astrophysics Data System (ADS)

    Dudnikov, V.; Dudnikova, G.

    2016-02-01

    Factors limiting operating lifetime of a Compact Surface Plasma Sources (CSPS) are analyzed and possible treatments for lifetime enhancement are considered. Increased cooling permeate increased discharge power and increased beam intensity and duty factor. A design of an advanced CSPS with geometrical focusing of H- flux is presented.

  16. EDITORIAL: Focus on High Energy Cosmic Rays FOCUS ON HIGH ENERGY COSMIC RAYS

    NASA Astrophysics Data System (ADS)

    Teshima, Masahiro; Watson, Alan A.

    2009-06-01

    The topic of high-energy cosmic rays has recently attracted significant attention. While the AGASA and HiRes Observatories have closed after many years of successful operation, the Pierre Auger Observatory began taking data in January 2004 and the first results have been reported. Plans for the next generation of instruments are in hand: funding is now being sought for the northern phase of the Auger Observatory and plans for a space detector, JEM-EUSO, to be launched in 2013-14 are well advanced with the long-term target of a dedicated satellite for the 2020s. It therefore seemed an appropriate time to make a collection of outstanding and original research articles from the leading experimental groups and from some of the theorists who seek to interpret the hard-won data and to speculate on the origin of the highest energy cosmic rays. This focus issue in New Journal of Physics on the topic of high energy cosmic rays, contains a comprehensive account of the work of the Yakutsk group (A A Ivanov, S P Knurenko and I Ye Sleptsov) who have used Cerenkov radiation produced by shower particles in the air to provide the basis for energy calibration. This technique contrasts with that of detecting fluorescence radiation from space that is proposed for the JEM-EUSO instrument to be placed on the International Space Station in 2013, described by Y Takahashi. Supplementing this is an article by A Santangelo and A Petrolini describing the scientific goals, requirements and main instrument features of the Super Extreme Universe Space Observatory mission (S-EUSO). The use of fluorescence light to measure energies was the key component of the HiRes instrument and is also used extensively by the Pierre Auger Collaboration so an article, by F Arqueros, F Blanco and J Rosado, summarizing the properties of fluorescence emission, still not fully understood, is timely. M Nagano, one of the architects of the AGASA Observatory, has provided an overview of the experimental situation with

  17. Dense Plasma Focus Z-Pinch Fully Kinetic Modeling and Ion Probe-Beam Experiments

    NASA Astrophysics Data System (ADS)

    Schmidt, Andrea

    2013-10-01

    The Z-pinch phase of a dense plasma focus (DPF) emits multiple-MeV ions on a cm-scale length, even for kJ-scale devices. The mechanisms through which these physically simple devices generate such high energy beams in a relatively short distance are not fully understood. We are exploring the mechanisms behind these large gradients using the first fully kinetic simulations of a DPF Z-pinch as well as an ion probe beam experiment in which a 4 MeV deuteron beam is injected along the z-axis of a DPF Z-pinch plasma and accelerated. Our table-top DPF has demonstrated >50 MV/m acceleration gradients during 800 J operation using a fast capacitive driver. We have now directly measured the DPF gradients and demonstrated acceleration of an injected ion beam for the first time. Our particle-in-cell simulations have successfully predicted observed DPF ion beams and neutron yield, which past fluid simulations have not reproduced. We have now experimentally measured and observed in the simulations for the first time, electric field oscillations near the lower hybrid frequency. This is suggestive that the lower hybrid drift instability, long speculated to be the cause of the anomalous plasma resistivity that produces large DPF gradients, is playing an important role. Direct comparisons between the experiment and simulations enhance our understanding of these plasmas and provide predictive design capability for accelerator and neutron source applications. This work performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344 and supported by the Laboratory Directed Research and Development Program (11-ERD-063) at LLNL.

  18. Transport of Helium Pickup Ions within the Focusing Cone: Reconciling STEREO Observations with IBEX

    NASA Astrophysics Data System (ADS)

    Quinn, P. R.; Schwadron, N. A.; Möbius, E.

    2016-06-01

    Recent observations of the pickup helium focusing cone by STEREO/Plasma and Suprathermal Ion Composition indicate an inflow longitude of the interstellar wind that differs from the observations of IBEX by 1\\buildrel{\\circ}\\over{.} 8+/- 2\\buildrel{\\circ}\\over{.} 4. It has been under debate whether the transport of helium pickup ions with an anisotropic velocity distribution is the cause of this difference. If so, the roughly field-aligned pickup ion streaming relative to the solar wind should create a shift in the pickup ion density relative to the focusing cone. A large pickup ion streaming depends on the size of the mean free path. Therefore, the observed longitudinal shift in the pickup ion density relative to the neutral focusing cone may carry fundamental information about the mean free path experienced by pickup ions inside 1 au. We test this hypothesis using the Energetic Particle Radiation Environment Module (EPREM) model by simulating the transport of helium pickup ions within the focusing cone finding a mean free path of {λ }\\parallel =0.19+0.29(-0.19) au. We calculate the average azimuthal velocity of pickup ions and find that the anisotropic distribution reaches ˜8% of the solar wind speed. Lastly, we isolate transport effects within EPREM, finding that pitch-angle scattering, adiabatic focusing, perpendicular diffusion, and particle drift contribute to shifting the focusing cone 20.00%, 69.43%, 10.56%, and \\lt 0.01 % , respectively. Thus we show with the EPREM model that the transport of pickup ions does indeed shift the peak of the focusing cone relative to the progenitor neutral atoms and this shift provides fundamental information on the scattering of pickup ions inside 1 au.

  19. Process in high energy heavy ion acceleration

    NASA Astrophysics Data System (ADS)

    Dinev, D.

    2009-03-01

    A review of processes that occur in high energy heavy ion acceleration by synchrotrons and colliders and that are essential for the accelerator performance is presented. Interactions of ions with the residual gas molecules/atoms and with stripping foils that deliberately intercept the ion trajectories are described in details. These interactions limit both the beam intensity and the beam quality. The processes of electron loss and capture lie at the root of heavy ion charge exchange injection. The review pays special attention to the ion induced vacuum pressure instability which is one of the main factors limiting the beam intensity. The intrabeam scattering phenomena which restricts the average luminosity of ion colliders is discussed. Some processes in nuclear interactions of ultra-relativistic heavy ions that could be dangerous for the performance of ion colliders are represented in the last chapter.

  20. Main magnetic focus ion source: Basic principles, theoretical predictions and experimental confirmations

    NASA Astrophysics Data System (ADS)

    Ovsyannikov, V. P.; Nefiodov, A. V.

    2016-03-01

    It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, extremely high electron current densities can be attained on short length of the ion trap. The design of very compact ion sources of the new generation is presented. The computer simulations predict that for such ions as, for example, Ne8+ and Xe44+, the intensities of about 109 and 106 ions per second, respectively, can be obtained. The experiments with pilot example of the ion source confirm efficiency of the suggested method. The X-ray emission from Ir59+, Xe44+ and Ar16+ ions was detected. The control over depth of the local ion trap is shown to be feasible.

  1. Focused ion beam (FIB)/scanning electron microscopy (SEM) in tissue structural research.

    PubMed

    Leser, Vladka; Milani, Marziale; Tatti, Francesco; Tkalec, Ziva Pipan; Strus, Jasna; Drobne, Damjana

    2010-10-01

    The focused ion beam (FIB) and scanning electron microscope (SEM) are commonly used in material sciences for imaging and analysis of materials. Over the last decade, the combined FIB/SEM system has proven to be also applicable in the life sciences. We have examined the potential of the focused ion beam/scanning electron microscope system for the investigation of biological tissues of the model organism Porcellio scaber (Crustacea: Isopoda). Tissue from digestive glands was prepared as for conventional SEM or as for transmission electron microscopy (TEM). The samples were transferred into FIB/SEM for FIB milling and an imaging operation. FIB-milled regions were secondary electron imaged, back-scattered electron imaged, or energy dispersive X-ray (EDX) analyzed. Our results demonstrated that FIB/SEM enables simultaneous investigation of sample gross morphology, cell surface characteristics, and subsurface structures. The same FIB-exposed regions were analyzed by EDX to provide basic compositional data. When samples were prepared as for TEM, the information obtained with FIB/SEM is comparable, though at limited magnification, to that obtained from TEM. A combination of imaging, micro-manipulation, and compositional analysis appears of particular interest in the investigation of epithelial tissues, which are subjected to various endogenous and exogenous conditions affecting their structure and function. The FIB/SEM is a promising tool for an overall examination of epithelial tissue under normal, stressed, or pathological conditions.

  2. Enhanced collective focusing of intense neutralized ion beam pulses in the presence of weak solenoidal magnetic fields

    SciTech Connect

    Dorf, Mikhail A.; Davidson, Ronald C.; Kaganovich, Igor D.; Startsev, Edward A.

    2012-05-31

    In this study, the design of ion drivers for warm dense matter and high energy density physics applications and heavy ion fusion involves transverse focusing and longitudinal compression of intense ion beams to a small spot size on the target. To facilitate the process, the compression occurs in a long drift section filled with a dense background plasma, which neutralizes the intense beam self-fields. Typically, the ion bunch charge is better neutralized than its current, and as a result a net self-pinching (magnetic) force is produced. The self-pinching effect is of particular practical importance, and is used in various ion driver designs in order to control the transverse beam envelope. In the present work we demonstrate that this radial self-focusing force can be significantly enhanced if a weak (B~100 G) solenoidal magnetic field is applied inside the neutralized drift section, thus allowing for substantially improved transport. It is shown that in contrast to magnetic self-pinching, the enhanced collective self-focusing has a radial electric field component and occurs as a result of the overcompensation of the beam charge by plasmaelectrons, whereas the beam current becomes well-neutralized. As the beam leaves the neutralizing drift section, additional transverse focusing can be applied. For instance, in the neutralized drift compression experiments (NDCX) a strong (several Tesla) final focus solenoid is used for this purpose. In the present analysis we propose that the tight final focus in the NDCX experiments may possibly be achieved by using a much weaker (few hundred Gauss) magnetic lens, provided the ion beam carries an equal amount of co-moving neutralizing electrons from the preceding drift section into the lens. In this case the enhanced focusing is provided by the collective electrondynamics strongly affected by a weak applied magnetic field.

  3. Energy focusing inside a dynamical cavity

    PubMed

    Colanero; Chu

    2000-12-01

    We study the exact classical solutions for a real scalar field inside a cavity with a wall whose motion is self-consistently determined by the pressure of the field itself. We find that, regardless of the system parameters, the long-time solution always becomes nonadiabatic and the field's energy concentrates into narrow peaks, which we explain by means of a simple mechanical system. We point out implications for the quantized theory. PMID:11138168

  4. A new route to nanoscale tomographic chemical analysis: Focused ion beam-induced auger electron spectrosocpy

    NASA Astrophysics Data System (ADS)

    Parvaneh, Hamed

    This research project is aimed to study the application of ion-induced Auger electron spectroscopy (IAES) in combination with the characteristics of focused ion beam (FIB) microscopy for performing chemical spectroscopy and further evaluate its potential for 3-dimensional chemical tomography applications. The mechanism for generation of Auger electrons by bombarding ions is very different from its electron induced counterpart. In the conventional electron-induced Auger electron spectroscopy (EAES), an electron beam with energy typically in the range 1-10kV is used to excite inner-shell (core) electrons of the solid. An electron from a higher electron energy state then de-excites to fill the hole and the extra energy is then transferred to either another electron, i.e. the Auger electron, or generation of an X-ray (photon). In both cases the emitting particles have charac-teristic energies and could be used to identify the excited target atoms. In IAES, however, large excitation cross sections can occur by promotion of in-ner shell electrons through crossing of molecular orbitals. Originally such phenomenological excitation processes were first proposed [3] for bi-particle gas phase collision systems to explain the generation of inner shell vacancies in violent collisions. In addition to excitation of incident or target atoms, due to a much heavier mass of ions compared to electrons, there would also be a substantial momentum transfer from the incident to the target atoms. This may cause the excited target atom to recoil from the lattice site or alternatively sputter off the surface with the possibility of de-excitation while the atom is either in motion in the matrix or traveling in vacuum. As a result, one could expect differences between the spectra induced by incident electrons and ions and interpretation of the IAE spectra requires separate consideration of both excitation and decay processes. In the first stage of the project, a state-of-the-art mass

  5. Low energy ion beam dynamics of NANOGAN ECR ion source

    NASA Astrophysics Data System (ADS)

    Kumar, Sarvesh; Mandal, A.

    2016-04-01

    A new low energy ion beam facility (LEIBF) has been developed for providing the mass analyzed highly charged intense ion beams of energy ranging from a few tens of keV to a few MeV for atomic, molecular and materials sciences research. The new facility consists of an all permanent magnet 10 GHz electron cyclotron resonance (ECR) ion source (NANOGAN) installed on a high voltage platform (400 kV) which provides large currents of multiply charged ion beams. Higher emittance at low energy of intense ion beam puts a tremendous challenge to the beam optical design of this facility. The beam line consists of mainly the electrostatic quadrupoles, an accelerating section, analyzing cum switching magnet and suitable beam diagnostics including vacuum components. The accelerated ion beam is analyzed for a particular mass to charge (m/q) ratio as well as guided to three different lines along 75°, 90° and 105° using a large acceptance analyzing cum switching magnet. The details of transverse beam optics to all the beam lines with TRANSPORT and GICOSY beam optics codes are being described. Field computation code, OPERA 3D has been utilized to design the magnets and electrostatic quadrupoles. A theoretical estimation of emittance for optimized geometry of ion source is given so as to form the basis of beam optics calculations. The method of quadrupole scan of the beam is used to characterize the emittance of the final beam on the target. The measured beam emittance increases with m/q ratios of various ion beams similar to the trend observed theoretically.

  6. Medium energy heavy ion operations at RHIC

    SciTech Connect

    Drees, K.A.; Ahrens, L.; Bai, M.; Beebe-Wang, J.; Blackler, I.M.C.; Blaskiewicz, M.; Brown, K.A.; Brennan, M.; Bruno, D.; Butler, J.; Carlson, C.; Connolly, R.; D'Ottavio, T.; Fischer, W.; Fu, W.; Gassner, D.; Harvey, M.; Hayes, T.; Huang, H.; Hulsart, R.; Ingrassia, P.; Kling, N.; Lafky, M.; Laster, J.; Lee, R.C.; Litvinenko, V.; Luo, Y.; MacKay, W.W.; Marr, G.; Mapes. M.; Marusic, A.; Mernick, K.; Michnoff, R.; Minty, M.; Montag, C.; Morris, J.; Naylor, C.; Nemesure, S.; Pilat, F.; Ptitsyn, V.; Robert-Demolaize, G.; Roser, T.; Sampson, P.; Satogata, T.; Schoefer, V.; Schultheiss, C.; Severino, F.; Shrey, T.; Smith, K.S.; Tepikian, S.; Thieberger, P.; Trbojevic, D.; Tsoupas, N.; Tuozzolo, J.; van Kuik, B.; Wilinski, M.; Zaltsman, A.; Zeno, K.; Zhang, S.Y.

    2011-03-28

    As part of the search for a phase transition or critical point on the QCD phase diagram, an energy scan including 5 different energy settings was performed during the 2010 RHIC heavy ion run. While the top beam energy for heavy ions is at 100 GeV/n and the lowest achieved energy setpoint was significantly below RHICs injection energy of approximately 10 GeV/n, we also provided beams for data taking in a medium energy range above injection energy and below top beam energy. This paper reviews RHIC experience and challenges for RHIC medium energy operations that produced full experimental data sets at beam energies of 31.2 GeV/n and 19.5 GeV/n. The medium energy AuAu run covered two beam energies, both above the RHIC injection energy of 9.8 GeV but well below the standard store energy of 100 GeV (see table 1). The low energy and full energy runs with heavy ions in FY10 are summarized in [1] and [2]. Stochastic Cooling ([3]) was only used for 100 GeV beams and not used in the medium energy run. The efficiency of the transition from 100 GeV operation to 31.2 GeV and then to 19.5 GeV was remarkable. Setup took 32 h and 19 h respectively for the two energy settings. The time in store, defined to be the percentage of time RHIC provides beams in physics conditions versus calendar time, was approximately 52% for the entire FY10 heavy ion run. In both medium energy runs it was well above this average, 68% for 31.5 GeV and 82% for 19.5 GeV. For both energies RHIC was filled with 111 bunches with 1.2 10{sup 9} and 1.3 10{sup 9} ions per bunch respectively.

  7. Sputtering Threshold Energies of Heavy Ions

    NASA Technical Reports Server (NTRS)

    Mantenieks, Maris A.

    1999-01-01

    Sputter erosion in ion thrusters has been measured in lifetests at discharge voltages as low as 25 V. Thruster operation at this discharge voltage results in component erosion rates sufficiently low to satisfy most mission requirements. It has been recognized that most of the internal sputtering in ion thrusters is done by doubly charged ions. Knowledge of the sputtering threshold voltage of a xenon molybdenum system would be beneficial in understanding the sputtering process as well as making more accurate calculations of the sputtering rates of ion thruster components. Sputtering threshold energies calculated from various formulations found in the literature results in values ranging from 28 to 200 eV. It is evident that some of these formulations cannot be relied upon to provide sputtering thresholds with any degree of accuracy. This paper re-examines the threshold energies measurements made in the early sixties by Askerov and Sena, and Stuart and Wehner. The threshold voltages as derived by Askerov and au have been reevaluated by using a different extrapolation method of sputter yields at low ion energies. The resulting threshold energies are in general similar to those measured by Stuart and Wehner. An empirical relationship is derived,for mercury and xenon ions for the ratio of the sputtering threshold energy to the sublimation energy as a function of the ratio of target to ion atomic mass.

  8. Angular distribution of energetic argon ions emitted by a 90 kJ Filippov-type plasma focus

    SciTech Connect

    Pestehe, S. J.; Mohammadnejad, M.

    2015-02-15

    Characteristics of the energetic argon ions emitted by a 90 kJ Filippov-type plasma focus are studied by employing an array of Faraday cups. The Faraday cups are designed to minimize the secondary electron emission effects on their response. Angular distribution of the ions is measured, and the results indicate a highly anisotropic emission with a dip at the device axis and a local maximum at the angle of 7° with respect to the axis. It has been argued that this kind of anisotropic emission may be related to the surfatron acceleration mechanism and shown that this behavior is independent of the working gas pressure. It has been also demonstrated that this mechanism is responsible for the generation of MeV ions. Measuring the total ion number at different working gas pressures gives an optimum pressure of 0.3 Torr. In addition, the energy spectrum of ions is measured by taking into account of the ambient gas effects on the energy and charge of the ions. The current neutralization effect of electrons trapped in the ion beam as well as the effect of conducting boundaries surrounding the beam, on the detected signals are investigated.

  9. Focusing of intense and divergent ion beams in a magnetic mass analyzer

    SciTech Connect

    Jianlin, Ke; Changgeng, Zhou; Rui, Qiu; Yonghong, Hu

    2014-07-15

    A magnetic mass analyzer is used to determine the beam composition of a vacuum arc ion source. In the analyzer, we used the concentric multi-ring electrodes to focus the intense and divergent ion beams. We describe the principle, design, and the test results of the focusing device. The diameter of the beam profile is less than 20 mm when the accelerating voltage is 30 kV and the focusing voltage is about 2.0 kV. The focusing device has been successfully used in the magnetic mass analyzer to separate Ti{sup +}, Ti{sup 2+}, and Ti{sup 3+}.

  10. Ion beam measurement using Rogowski coils in a hundred of joules dense plasma focus device.

    NASA Astrophysics Data System (ADS)

    Jain, J.; Moreno, J.; Pavez, C.; Bora, B.; Inestrosa-Izurieta, M. J.; Avaria, G.; Soto, L.

    2016-05-01

    In present work an effort has been made to measure the ion beams generated during experiment with PF-400J plasma focus device, using an array of two Rogowski coils with time of flight analysis. It was found that the coils measure the signals of beam for a particular range of operating pressure. The beam signals were recorded at 20, 15, 12, 10, 9,8,7,6 and 5 mbar filled pressure of hydrogen gas. The optimized pressure range for good plasma column formation for this device was found about 9 mbar. At 15 mbar no or very weak beam signals were observed by Rogowski coil which was kept relatively far from the top of the anode and at 20 mbar there were no beam signals observed in both of the coils. The calculated beam energy is found to have maximum value at 9 mbar of filled hydrogen gas pressure.

  11. Focused-Ion-Beam Induced Rayleigh-Plateau Instability for Diversiform Suspended Nanostructure Fabrication

    PubMed Central

    Li, Can; Zhao, Lurui; Mao, Yifei; Wu, Wengang; Xu, Jun

    2015-01-01

    A novel method for fabricating diversiform suspended nanostructures is reported. The method utilizes focused-ion-beam (FIB) induced material redistribution and Rayleigh-Plateau instability, which determine the resulting shapes of formed nanostructures. By choosing target materials, their predefined patterns as well as FIB settings, we have achieved parallel nanofabrication of various kinds including nanostrings, nanobead chains and nanopore membranes with smooth surfaces due to the self-perfection effect of the material redistribution upon the minimization of system free energy. The diameters of the nanostrings and nanopores reach about 10 nm and 200 nm, respectively. The average period of the nanobead chains is 250 nm. PMID:25649055

  12. H-mode accelerating structures with PMQ focusing for low-beta ion beams

    SciTech Connect

    Kurennoy, Sergey S; O' Hara, James F; Olivas, Eric R; Rybarcyk, Lawrence J

    2010-01-01

    We are developing high-efficiency normal-conducting RF accelerating structures based on inter-digital H-mode (IH) cavities and the transverse beam focusing with permanent-magnet quadrupoles (PMQ), for beam velocities in the range of a few percent of the speed of light. Such IH-PMQ accelerating structures following a short RFQ can be used in the front end of ion linacs or in stand-alone applications, e.g. a compact deuteron-beam accelerator up to the energy of several MeV. Results of combined 3-D modeling for a full IH-PMQ accelerator tank - electromagnetic computations, beam-dynamics simulations with high currents, and thermal-stress analysis - are presented. The accelerating field profile in the tank is tuned to provide the best beam propagation using coupled iterations of electromagnetic and beam-dynamics modeling. A cold model of the IH-PMQ tank is being manufactured.

  13. Enhanced collective focusing of intense neutralized ion beam pulses in the presence of weak solenoidal magnetic fields

    DOE PAGES

    Dorf, Mikhail A.; Davidson, Ronald C.; Kaganovich, Igor D.; Startsev, Edward A.

    2012-05-31

    In this study, the design of ion drivers for warm dense matter and high energy density physics applications and heavy ion fusion involves transverse focusing and longitudinal compression of intense ion beams to a small spot size on the target. To facilitate the process, the compression occurs in a long drift section filled with a dense background plasma, which neutralizes the intense beam self-fields. Typically, the ion bunch charge is better neutralized than its current, and as a result a net self-pinching (magnetic) force is produced. The self-pinching effect is of particular practical importance, and is used in various ionmore » driver designs in order to control the transverse beam envelope. In the present work we demonstrate that this radial self-focusing force can be significantly enhanced if a weak (B~100 G) solenoidal magnetic field is applied inside the neutralized drift section, thus allowing for substantially improved transport. It is shown that in contrast to magnetic self-pinching, the enhanced collective self-focusing has a radial electric field component and occurs as a result of the overcompensation of the beam charge by plasmaelectrons, whereas the beam current becomes well-neutralized. As the beam leaves the neutralizing drift section, additional transverse focusing can be applied. For instance, in the neutralized drift compression experiments (NDCX) a strong (several Tesla) final focus solenoid is used for this purpose. In the present analysis we propose that the tight final focus in the NDCX experiments may possibly be achieved by using a much weaker (few hundred Gauss) magnetic lens, provided the ion beam carries an equal amount of co-moving neutralizing electrons from the preceding drift section into the lens. In this case the enhanced focusing is provided by the collective electrondynamics strongly affected by a weak applied magnetic field.« less

  14. Focused ion beam techniques for fabricating geometrically-complex components and devices.

    SciTech Connect

    Mayer, Thomas Michael; Adams, David Price; Hodges, V. Carter; Vasile, Michael J.

    2004-03-01

    We have researched several new focused ion beam (FIB) micro-fabrication techniques that offer control of feature shape and the ability to accurately define features onto nonplanar substrates. These FIB-based processes are considered useful for prototyping, reverse engineering, and small-lot manufacturing. Ion beam-based techniques have been developed for defining features in miniature, nonplanar substrates. We demonstrate helices in cylindrical substrates having diameters from 100 {micro}m to 3 mm. Ion beam lathe processes sputter-define 10-{micro}m wide features in cylindrical substrates and tubes. For larger substrates, we combine focused ion beam milling with ultra-precision lathe turning techniques to accurately define 25-100 {micro}m features over many meters of path length. In several cases, we combine the feature defining capability of focused ion beam bombardment with additive techniques such as evaporation, sputter deposition and electroplating in order to build geometrically-complex, functionally-simple devices. Damascene methods that fabricate bound, metal microcoils have been developed for cylindrical substrates. Effects of focused ion milling on surface morphology are also highlighted in a study of ion-milled diamond.

  15. EDITORIAL: Focus on High Energy Particle Astronomy FOCUS ON HIGH ENERGY PARTICLE ASTRONOMY

    NASA Astrophysics Data System (ADS)

    Ong, Rene A.; Covault, Corbin E.

    2009-05-01

    another clue to understanding the nature of high-energy objects both within and outside our galaxy. And yet, along with new understandings, we are also faced with new puzzles. Each of the papers in this focus issue presents the field of high-energy particle astronomy from the perspective of a given instrumental approach, corresponding to the current state-of-the-art for a particular class of messenger particle in a given energy range. For gamma-ray astronomy, we have a excellent report by R Johnson and R Mukherjee on results from space-borne telescopes, first from the Compton Gamma Ray Observatory and then from the recently commissioned Fermi Gamma-Ray Space Telescope. The detailed paper by J Hinton describes a wealth of results from several ground-based gamma-ray telescopes using the atmospheric Cherenokov technique. Gamma-ray results and the prospects from air-shower detectors which can provide all-sky monitoring are very well described in a paper by G Sinnis. Larger plans for the future of ground-based gamma-ray astronomy are summarized in a paper by F Krennrich (in preparation). We also include two papers for 'non-photon' particle detection, a summary of the exciting new results for cosmic ray physics by P Sommers and S Westerhoff and an article by K Hoffman describing the astrophysics and capabilities of truly remarkable, large-volume neutrino detectors. For both cosmic rays and neutrinos, the fields seem to be on the threshold of doing astronomy—that is, associating specific detected particles with particular astrophysical objects. Together, the fully operational space- and ground-based gamma-ray observatories and the new large-area experiments for cosmic ray and neutrino detection represent a new era in astronomy. We can be confident that the field of high-energy particle astronomy will continue to rapidly develop as more exciting results from these instruments are reported in the future. Focus on High Energy Particle Astronomy Contents Gamma ray astronomy with

  16. Fabrication of Amorphous Indium Gallium Zinc Oxide Thin Film Transistor by using Focused Ion Beam

    NASA Astrophysics Data System (ADS)

    Zhu, Wencong

    Compared with other transparent semiconductors, amorphous indium gallium zinc oxide (a-IGZO) has both good uniformity and high electron mobility, which make it as a good candidate for displays or large-scale transparent circuit. The goal of this research is to fabricate alpha-IGZO thin film transistor (TFT) with channel milled by focused ion beam (FIB). TFTs with different channel geometries can be achieved by applying different milling strategies, which facilitate modifying complex circuit. Technology Computer-Aided Design (TCAD) was also introduced to understand the effect of trapped charges on the device performance. The investigation of the trapped charge at IGZO/SiO2 interface was performed on the IGZO TFT on p-Silicon substrate with thermally grown SiO2 as dielectric. The subgap density-of-state model was used for the simulation, which includes conduction band-tail trap states and donor-like state in the subgap. The result shows that the de-trapping and donor-state ionization determine the interface trapped charge density at various gate biases. Simulation of IGZO TFT with FIB defined channel on the same substrate was also applied. The drain and source were connected intentionally during metal deposition and separated by FIB milling. Based on the simulation, the Ga ions in SiO2 introduced by the ion beam was drifted by gate bias and affects the saturation drain current. Both side channel and direct channel transparent IGZO TFTs were fabricated on the glass substrate with coated ITO. Higher ion energy (30 keV) was used to etch through the substrate between drain and source and form side channels at the corner of milled trench. Lower ion energy (16 keV) was applied to stop the milling inside IGZO thin film and direct channel between drain and source was created. Annealing after FIB milling removed the residual Ga ions and the devices show switch feature. Direct channel shows higher saturation drain current (~10-6 A) compared with side channel (~10-7 A) because

  17. Effect of using stencil masks made by focused ion beam milling on permalloy (Ni81Fe19) nanostructures.

    PubMed

    Bates, J R; Miyahara, Y; Burgess, J A J; Iglesias-Freire, O; Grütter, P

    2013-03-22

    Focused ion beam (FIB) milling is a common fabrication technique to make nanostencil masks which has the unintended consequence of gallium ion implantation surrounding milled features in silicon nitride membranes. We observe major changes in film structure, chemical composition, and magnetic behaviour of permalloy nanostructures deposited by electron beam evaporation using silicon nitride stencil masks made by a FIB as compared to stencil masks made by regular lithography techniques. We characterize the stenciled structures and both types of masks using transmission electron microscopy, electron energy loss spectroscopy, energy dispersive x-ray spectroscopy, magnetic force microscopy and kelvin probe force microscopy. All these techniques demonstrate distinct differences at a length scale of a 1-100 nm for the structures made using stencil mask fabricated using a FIB. The origin of these differences seems to be related to the presence of implanted ions, a detailed understanding of the mechanism however remains to be developed. PMID:23449320

  18. Measurements of low energy auroral ions

    NASA Astrophysics Data System (ADS)

    Urban, A.

    1981-12-01

    Ion measurements in the energy range 0.1-30 keV observed during the 'Substorm Phenomena' and 'Porcupine' campaigns are summarized. Acceleration of the ions by an electrostatic field aligned parallel to the magnetic field is identified and found to be accompanied by intense electron precipitation. On the other hand, deceleration of the ions is observed in other field-aligned current sheets which are indicated by the electron and magnetic field measurements. Temporal successive monoenergetic ion variations suggest energy dispersion and a location of the source region at 9 earth radii. What is more, ion fluxes higher than those of the electrons are measured at pitch angles parallel to the magnetic field. It is noted that each of the examples was observed during different flights.

  19. Determination of optimum voltages of ion focusing devices using computer techniques

    NASA Technical Reports Server (NTRS)

    Eckstein, B. A.

    1980-01-01

    Electric potentials for two dimensional cross sections of ion focusing devices used in a mass spectrometer are calculated via a series of computer programs designed to compute potentials between areas of fixed voltages. Ion trajectories within these devices may be determined by computer and a histogram obtained which plots ion density against ion position along a plate of the focusing device. For each lens system, a plate voltage may be changed, the electric potentials recalculated, and a new histogram calculated in order to determine if the new voltage configuration has increased the device's efficiency. This process may be repeated until the optimum voltage values have been found for maximum particle transmission in each focusing device.

  20. Subwavelength-scale tailoring of surface phonon polaritons by focused ion-beam implantation.

    PubMed

    Ocelic, N; Hillenbrand, R

    2004-09-01

    Recent advances in optical nanotechnologies by controlling surface plasmon polaritons in metallic nanostructures demonstrate high potential for subwavelength-scale waveguiding of light, data storage, microscopy or biophotonics. Surprisingly, surface phonon polaritons-infrared counterparts to surface plasmon polaritons-have not been widely explored for nanophotonic applications. As they rely on the infrared or terahertz excitation of lattice vibrations in polar crystals they offer totally different material classes for nanophotonic applications, such as semiconductors and insulators. In an initial step towards nanoscale surface phonon photonics we show evidence that the local properties of surface phonon polaritons can be tailored at a subwavelength-scale by focused ion-beam modification of the crystal structure, even without significant alteration of the surface topography. Such single-step-fabricated, monolithic structures could be used for controlling electromagnetic energy transport by surface phonon polaritons in miniaturized integrated devices operating at infrared or terahertz frequencies. We verify the polaritonic properties of an ion-beam-patterned SiC surface by infrared near-field microscopy. The near-field images also demonstrate nanometre-scale resolved infrared mapping of crystal quality useful in semiconductor processing or crystal growth.

  1. Focused Ion Beam Recovery of Hypervelocity Impact Residue in Experimental Craters on Metallic Foils.

    SciTech Connect

    Graham, G A; Teslich, N; Dai, Z R; Bradley, J P; Kearsley, A T; Horz, F

    2005-11-04

    The Stardust sample return capsule will return to Earth in January 2006 with primitive debris collected from Comet 81P/Wild-2 during the fly-by encounter in 2004. In addition to the cometary particles embedded in low-density silica aerogel, there will be microcraters preserved in the Al foils (1100 series; 100 {micro}m thick) that are wrapped around the sample tray assembly. Soda lime spheres ({approx}49 {micro}m in diameter) have been accelerated with a Light Gas Gun into flight-grade Al foils at 6.35 km s{sup -1} to simulate the capture of cometary debris. The experimental craters have been analyzed using scanning electron microscopy (SEM) and x-ray energy dispersive spectroscopy (EDX) to locate and characterize remnants of the projectile material remaining within the craters. In addition, ion beam induced secondary electron imaging has proven particularly useful in identifying areas within the craters that contain residue material. Finally, high-precision focused ion beam (FIB) milling has been used to isolate and then extract an individual melt residue droplet from the interior wall of an impact. This enabled further detailed elemental characterization, free from the background contamination of the Al foil substrate. The ability to recover ''pure'' melt residues using FIB will significantly extend the interpretations of the residue chemistry preserved in the Al foils returned by Stardust.

  2. Focus ion beam-induced mechanical stress switching in an ultra-fast resistive switching device

    NASA Astrophysics Data System (ADS)

    Yang, Xiang

    2016-06-01

    The Mo/Si3N4:Pt/Pt nanometallic resistive switching devices with ultra-fast write/erase speed (<50 ns) were fabricated. Other than conventional electrical switching, a mechanical stress-induced switching was demonstrated. Such mechanical stress was provided by momentum transfer of 30 keV Ga+ ions in a focus ion beam system, enabling a one-way high resistance state (HRS) to low resistance state (LRS) transition. The capability of mechanical stress switching provides evidence that electron trapping/detrapping mechanism is responsible for nanometallic resistive switching. It was further demonstrated that HRS (trapping state) is a meta-stable state, while LRS (detrapping state) is a stable state. Strong mechanical stress facilitates local bond distortion in dielectric films and thus lowers the energy barrier between HRS and LRS, eventually leading to a barrier-less state transition. A quantitative model based on stress-mediated parallel conduction paths were established to provide a more accurate description of the resistive switching devices.

  3. Focused Ion Beam Recovery of Hypervelocity Impact Residue in Experimental Craters on Metallic Foils

    NASA Technical Reports Server (NTRS)

    Graham, G. A.; Teslich, N.; Dai, Z. R.; Bradley, J. P.; Kearsley, A. T.; Horz, F.

    2006-01-01

    The Stardust sample return capsule will return to Earth in January 2006 with primitive debris collected from Comet 81P/Wild-2 during the fly-by encounter in 2004. In addition to the cometary particles embedded in low-density silica aerogel, there will be microcraters preserved in the Al foils (1100 series; 100 micrometers thick) that are wrapped around the sample tray assembly. Soda lime spheres (approximately 49 m in diameter) have been accelerated with a light-gas-gun into flight-grade Al foils at 6.35 km s(sup -1) to simulate the potential capture of cometary debris. The preserved crater penetrations have been analyzed using scanning electron microscopy (SEM) and x-ray energy dispersive spectroscopy (EDX) to locate and characterize remnants of the projectile material remaining within the craters. In addition, ion beam induced secondary electron imaging has proven particularly useful in identifying areas within the craters that contain residue material. Finally, high-precision focused ion beam (FIB) milling has been used to isolate and then extract an individual melt residue droplet from the interior wall of an impact penetration. This enabled further detailed elemental characterization, free from the background contamination of the Al foil substrate. The ability to recover pure melt residues using FIB will significantly extend the interpretations of the residue chemistry preserved in the Al foils returned by Stardust.

  4. Neutron and Ion Beams Emitted from Plasma Focus (112.5 J) Device

    NASA Astrophysics Data System (ADS)

    El-Aragi M., G.

    2010-02-01

    Preliminary results of recent experiments performed within the Mather-type 112.5 J plasma focus device are presented. The ion beams from the focus device operated with deuterium filling at 1 mbar were registered using CR-39 solid state nuclear track detectors (SSNTD) and a Faraday cup detector for time-resolved measurements. The time-resolved neutron emission from the focus region measurements was detected with a photomultiplier tube (IP-28) optically coupled with a plastic scintillator NE 102.

  5. Smooth transverse and longitudinal focusing in high-intensity ion linacs

    SciTech Connect

    Billen, J.H.; Takeda, Harunori; Young, L.M.

    1996-09-01

    We examine ion linac designs that start with a high energy radio- frequency quadrupole (RFQ) followed by either a drift-tube linac (DTL) or a coupled-cavity drift-tube linac (CCDTL). For high energies a conventional CCL follows the CCDTL. High RFQ output energy allows tailoring the transverse and longitudinal focusing strengths to match into the following structure. When the RFQ beam enters a higher frequency structure, the DTL or CCDTL starts with a low accelerating gradient and large negative synchronous phase. The gradient and phase both ramp up gradually to higher values. Other changes later in the machine are also gradual. Beam dynamics simulations show that these linacs require no separate matching sections. Applications include a cw 100 mA H{sup +} beam from a 350-MHz, 6.7 MeV RFQ injecting a 700 MHz CCDTL and CCL; a 7% duty 28 mA H{sup -} beam from a 402.5 MHz RFQ and DTL injecting 805 MHz structures; a cw 135 mA D{sup +} beam produced by a 175 MHz, 8 MeV RFQ and DTL; and a 2.4% duty, 80 mA H{sup +} beam using a 433 MHz 10 MeV RFQ and a 1300 MHz CCDTL. The machines take advantage of the considerable flexibility of the CCDTL. Designs can use a variety of different transverse focusing lattices. Use of two coupling cavity orientations permits a constant period even when the number of drift tubes per cavity changes along the linac.

  6. A 2D Particle in Cell model for ion extraction and focusing in electrostatic accelerators.

    PubMed

    Veltri, P; Cavenago, M; Serianni, G

    2014-02-01

    Negative ions are fundamental to produce intense and high energy neutral beams used to heat the plasma in fusion devices. The processes regulating the ion extraction involve the formation of a sheath on a scale comparable to the Debye length of the plasma. On the other hand, the ion acceleration as a beam is obtained on distances greater than λD. The paper presents a model for both the phases of ion extraction and acceleration of the ions and its implementation in a numerical code. The space charge of particles is deposited following usual Particle in Cell codes technique, while the field is solved with finite element methods. Some hypotheses on the beam plasma transition are described, allowing to model both regions at the same time. The code was tested with the geometry of the NIO1 negative ions source, and the results are compared with existing ray tracing codes and discussed.

  7. A 2D Particle in Cell model for ion extraction and focusing in electrostatic accelerators

    SciTech Connect

    Veltri, P. Serianni, G.; Cavenago, M.

    2014-02-15

    Negative ions are fundamental to produce intense and high energy neutral beams used to heat the plasma in fusion devices. The processes regulating the ion extraction involve the formation of a sheath on a scale comparable to the Debye length of the plasma. On the other hand, the ion acceleration as a beam is obtained on distances greater than λ{sub D}. The paper presents a model for both the phases of ion extraction and acceleration of the ions and its implementation in a numerical code. The space charge of particles is deposited following usual Particle in Cell codes technique, while the field is solved with finite element methods. Some hypotheses on the beam plasma transition are described, allowing to model both regions at the same time. The code was tested with the geometry of the NIO1 negative ions source, and the results are compared with existing ray tracing codes and discussed.

  8. A 2D Particle in Cell model for ion extraction and focusing in electrostatic accelerators

    NASA Astrophysics Data System (ADS)

    Veltri, P.; Cavenago, M.; Serianni, G.

    2014-02-01

    Negative ions are fundamental to produce intense and high energy neutral beams used to heat the plasma in fusion devices. The processes regulating the ion extraction involve the formation of a sheath on a scale comparable to the Debye length of the plasma. On the other hand, the ion acceleration as a beam is obtained on distances greater than λD. The paper presents a model for both the phases of ion extraction and acceleration of the ions and its implementation in a numerical code. The space charge of particles is deposited following usual Particle in Cell codes technique, while the field is solved with finite element methods. Some hypotheses on the beam plasma transition are described, allowing to model both regions at the same time. The code was tested with the geometry of the NIO1 negative ions source, and the results are compared with existing ray tracing codes and discussed.

  9. Low energy ion loss at Mars

    NASA Astrophysics Data System (ADS)

    Curry, S.; Liemohn, M.; Fang, X.; Ma, Y.

    2012-04-01

    Current data observations and modeling efforts have indicated that the low-energy pick-up ions on Mars significantly contribute to the overall escape rate. Due to the lack of a dipole magnetic field, the solar wind directly interacts with the dayside upper atmosphere causing particles to be stripped away. In this study, we use a 3-D Monte Carlo test particle simulation with virtual detectors to observe low energy ions (< 50 eV) in the Mars space environment. We will present velocity space distributions that can capture the asymmetric and non-gyrotropic features of particle motion. The effect of different solar conditions will also be discussed with respect to ion fluxes at various spatial locations as well as overall loss in order to robustly describe the physical processes controlling the distribution of planetary ions and atmospheric escape.

  10. Focus issue introduction: renewable energy and the environment.

    PubMed

    Seassal, Christian; Koshel, John

    2013-05-01

    This focus issue highlights selected contributions from authors who presented promising concepts at OSA's Renewable Energy and the Environment Optics and Photonics Congress held 11-15 November 2012 in Eindhoven, The Netherlands.

  11. Focused ion beam milling and ultramicrotomy of mineralised ivory dentine for analytical transmission electron microscopy.

    PubMed

    Jantou, V; Turmaine, M; West, G D; Horton, M A; McComb, D W

    2009-06-01

    The use of focused ion beam (FIB) milling for preparation of sections of mineralised ivory dentine for transmission electron microscopy (TEM) is investigated. Ivory dentine is essentially composed of fibrillar type-I collagen and apatite crystals. The aim of this project is to gain a clearer understanding of the relationship between the organic and inorganic components of ivory dentine using analytical TEM, in order to utilise these analytical techniques in the context of common skeletal diseases such as osteoporosis and arthritis. TEM sections were prepared in both single and dual beam FIB instruments, using two standard lift-out techniques, in situ and ex situ. The FIB sections were systematically compared with sections prepared by ultramicrotomy, the traditional preparation route in biological systems, in terms of structural and chemical differences. A clear advantage of FIB milling over ultramicrotomy is that dehydration, embedding and section flotation can be eliminated, so that partial mineral loss due to dissolution is avoided. The characteristic banding of collagen fibrils was clearly seen in FIB milled sections without the need for any chemical staining, as is commonly employed in ultramicrotomy. The FIB milling technique was able to produce high-quality TEM sections of ivory dentine, which are suitable for further investigation using electron energy-loss spectroscopy (EELS) and energy-filtering TEM (EFTEM) to probe the collagen/apatite interface.

  12. Radiation damage and its recovery in focused ion beam fabricated ferroelectric capacitors

    NASA Astrophysics Data System (ADS)

    Stanishevsky, A.; Nagaraj, B.; Melngailis, J.; Ramesh, R.; Khriachtchev, L.; McDaniel, E.

    2002-09-01

    We studied the effect of ion damage on the properties of 50 keV Ga+ focused ion beam fabricated lead-zirconate-titanate capacitors as a function of the ion dose. We observed significant modification in the chemical composition of the damaged layer due to loss of lead and oxygen, and gallium impurity accumulation. The 5-10 nm thick damaged layer becomes dielectric after annealing and does not recover its ferroelectric properties. This dielectric layer substantially reduces the actual volume of the ferroelectric material in sub-100 nm structures, and can affect their performance.

  13. Large Area Microcorrals and Cavity Formation on Cantilevers using a Focused Ion Beam

    SciTech Connect

    Saraf, Laxmikant V.; Britt, David W.

    2011-09-14

    We utilize focused ion beam (FIB) to explore various sputtering parameters to form large area microcorrals and cavities on cantilevers. Microcorrals were rapidly created by modifying ion beam blur and overlaps. Modification in FIB sputtering parameters affects the periodicity and shape of corral microstructure. Cantilever deflections show ion beam amorphization effects as a function of sputtered area and cantilever base cavities with or without side walls. The FIB sputtering parameters address a method for rapid creation of a cantilever tensiometer with integrated fluid storage and delivery.

  14. Direct patterning of vortex generators on a fiber tip using a focused ion beam.

    PubMed

    Vayalamkuzhi, Pramitha; Bhattacharya, Shanti; Eigenthaler, Ulrike; Keskinbora, Kahraman; Samlan, C T; Hirscher, Michael; Spatz, Joachim P; Viswanathan, Nirmal K

    2016-05-15

    The realization of spiral phase optical elements on the cleaved end of an optical fiber by focused ion beam milling is presented. A focused Ga+ ion beam with an acceleration voltage of 30 keV is used to etch continuous spiral phase plates and fork gratings directly on the tip of the fiber. The phase characteristics of the output beam generated by the fabricated structures measured via an interference experiment confirmed the presence of phase singularity in the output beam. The devices are expected to be promising candidates for all-fiber beam shaping and optical trapping applications.

  15. Focused ion beam post-processing of optical fiber Fabry-Perot cavities for sensing applications.

    PubMed

    André, Ricardo M; Pevec, Simon; Becker, Martin; Dellith, Jan; Rothhardt, Manfred; Marques, Manuel B; Donlagic, Denis; Bartelt, Hartmut; Frazão, Orlando

    2014-06-01

    Focused ion beam technology is combined with chemical etching of specifically designed fibers to create Fabry-Perot interferometers. Hydrofluoric acid is used to etch special fibers and create microwires with diameters of 15 μm. These microwires are then milled with a focused ion beam to create two different structures: an indented Fabry-Perot structure and a cantilever Fabry-Perot structure that are characterized in terms of temperature. The cantilever structure is also sensitive to vibrations and is capable of measuring frequencies in the range 1 Hz - 40 kHz.

  16. Ion-Atom and Ion-Molecule Hybrid Systems: Ion-Neutral Chemistry at Ultralow Energies

    NASA Astrophysics Data System (ADS)

    Eberle, Pascal; Dörfler, Alexander D.; von Planta, Claudio; Ravi, Krishnamurthy; Haas, Dominik; Zhang, Dong; van de Meerakker, Sebastiaan Y. T.; Willitsch, Stefan

    2015-09-01

    The study of chemical reactions between ions and neutral species at very low energies reveals precise informations about the dynamics of collisions and fine details of intermolecular interactions. Here, we report progress towards the development of next- generation experiments for the investigation of cold ion-neutral reactions. First, we present a new ’’dynamic” hybrid ion-atom trap which enables the study of collisions with a superior energy resolution accessing a regime in which quantum scattering resonances may become observable. Second, we discuss and numerically characterize the concept and properties of a hybrid trap for cold neutral molecules and molecular ions which paves the way for the study of ion-molecule reactions in the millikelvin regime.

  17. Focusing of baroclinic tidal energy in a canyon

    NASA Astrophysics Data System (ADS)

    Vlasenko, Vasiliy; Stashchuk, Nataliya; Inall, Mark E.; Porter, Marie; Aleynik, Dmitry

    2016-04-01

    Strong three-dimensional focusing of internal tidal energy in the Petite Sole Canyon in the Celtic Sea is analyzed using observational data and numerical modeling. In a deep layer (500-800 m) in the center of the canyon, shear variance was elevated by an order of magnitude. Corresponding large vertical oscillations of deep isotherms and a local maximum of horizontal velocity were replicated numerically using the MITgcm. The elevated internal tidal activity in the deep part of the canyon is explained in terms of the downward propagation and focusing of multiple internal tidal beams generated at the shelf break. The near-circular shape of the canyon head and steep bottom topography throughout the canyon (steeper than the tidal beam) create favorable conditions for the lens-like focusing of tidal energy in the canyon's center. Observations and modeling show that the energy focusing greatly intensifies local diapycnal mixing that leads to local formation of a baroclinic eddy.

  18. Solar Ion Sputter Deposition in the Lunar Regolith: Experimental Simulation Using Focused-Ion Beam Techniques

    NASA Technical Reports Server (NTRS)

    Christoffersen, R.; Rahman, Z.; Keller, L. P.

    2012-01-01

    As regions of the lunar regolith undergo space weathering, their component grains develop compositionally and microstructurally complex outer coatings or "rims" ranging in thickness from a few 10 s to a few 100's of nm. Rims on grains in the finest size fractions (e.g., <20 m) of mature lunar regoliths contain optically-active concentrations of nm size metallic Fe spherules, or "nanophase Fe(sup o)" that redden and attenuate optical reflectance spectral features important in lunar remote sensing. Understanding the mechanisms for rim formation is therefore a key part of connecting the drivers of mineralogical and chemical changes in the lunar regolith with how lunar terrains are observed to become space weathered from a remotely-sensed point of view. As interpreted based on analytical transmission electron microscope (TEM) studies, rims are produced from varying relative contributions from: 1) direct solar ion irradiation effects that amorphize or otherwise modify the outer surface of the original host grain, and 2) nanoscale, layer-like, deposition of extrinsic material processed from the surrounding soil. This extrinsic/deposited material is the dominant physical host for nanophase Fe(sup o) in the rims. An important lingering uncertainty is whether this deposited material condensed from regolith components locally vaporized in micrometeorite or larger impacts, or whether it formed as solar wind ions sputtered exposed soil and re-deposited the sputtered ions on less exposed areas. Deciding which of these mechanisms is dominant, or possibility exclusive, has been hampered because there is an insufficient library of chemical and microstructural "fingerprints" to distinguish deposits produced by the two processes. Experimental sputter deposition / characterization studies relevant to rim formation have particularly lagged since the early post-Apollo experiments of Hapke and others, especially with regard to application of TEM-based characterization techniques. Here

  19. Self-assembly of well-ordered and highly uniform nanoripples induced by focused ion beam

    NASA Astrophysics Data System (ADS)

    Zhang, Yunxiang; Ran, Guang

    2009-10-01

    Well-ordered and highly uniform nanoripple structures on the surface of single crystal LaAlO 3 (1 0 0), SrTiO 3 (1 0 0) and Al 2O 3 (0 0 0 1) were formed via self-assembly (not by beam writing) by focused ion-beam bombardment. The morphology and topography of nanoripple structures were characterized using in-situ focused ion-beam/scanning electron microscope, as well as ex-situ atomic force microscopy. Under off-normal bombardment without sample rotation, the characteristic wavelength of nanoripples varying from 248 to 395 nm on the LaAlO 3 (1 0 0) surface can be obtained by changing ion fluence and incident angle. When all sputtering parameters except the ion fluence are constant, the wavelength of nanoripples is increased with the enhanced ion fluence. These results demonstrate the potential application of using ion sputtering method for fabricating the well-ordered and highly uniform nanoripples which can be used in nanodevices.

  20. Flute instability of an ion-focused slab electron beam in a broad plasma

    SciTech Connect

    Whittum, D.H. , 1-1 Oho, Tsukuba, Ibaraki 305 ); Lampe, M.; Joyce, G.; Slinker, S.P. ); Yu, S.S.; Sharp, W.M. )

    1992-11-15

    An intense relativistic electron beam with an elongated cross section, propagating in the ion-focused regime through a broad, uniform, unmagnetized plasma, is shown to suffer a transverse flute instability. This instability arises from the electrostatic coupling between the beam and the plasma electrons at the ion-channel edge. The instability is found to be absolute and the asymptotic growth of the flute amplitude is computed in the frozen-field'' approximation and the large skin-depth limit. The minimum growth length is shown to be much less than the betatron period, with the consequence that focusing is rendered ineffective. It is further shown that growth is much reduced when the beam propagates through a narrow channel where the ion density greatly exceeds that of the surrounding plasma. In this limit, a modest spread in betatron frequency produces rapid saturation. The effect of plasma electron collisions is also considered. Results of beam breakup simulations are noted.

  1. Micro/nanofabrication of poly(L-lactic acid) using focused ion beam direct etching

    NASA Astrophysics Data System (ADS)

    Oyama, Tomoko Gowa; Hinata, Toru; Nagasawa, Naotsugu; Oshima, Akihiro; Washio, Masakazu; Tagawa, Seiichi; Taguchi, Mitsumasa

    2013-10-01

    Micro/nanofabrication of biocompatible and biodegradable poly(L-lactic acid) (PLLA) using focused Ga ion beam direct etching was evaluated for future bio-device applications. The fabrication performance was determined with different ion fluences and fluxes (beam currents), and it was found that the etching speed and fabrication accuracy were affected by irradiation-induced heat. Focused ion beam (FIB)-irradiated surfaces were analyzed using micro-area X-ray photoelectron spectroscopy. Owing to reactions such as the physical sputtering of atoms and radiation-induced decomposition, PLLA was gradually carbonized with increasing C=C bonds. Controlled micro/nanostructures of PLLA were fabricated with C=C bond-rich surfaces expected to have good cell attachment properties.

  2. Subsurface examination of a foliar biofilm using scanning electron- and focused-ion-beam microscopy

    Technology Transfer Automated Retrieval System (TEKTRAN)

    The dual beam scanning electron microscope, equipped with both a focused ion- and scanning electron- beam (FIB SEM) is a novel tool for the exploration of the subsurface structure of biological tissues. The FIB is capable of removing small cross sections to view the subsurface features and may be s...

  3. Sources and transport systems for low energy extreme of ion implantation

    SciTech Connect

    Hershcovitch, A.; Batalin, V.A.; Bugaev, A.S.; Gushenets, V.I.; Alexeyenko, O.; Gurkova, E.; Johnson, B.M.; Kolomiets, A.A.; Kropachev, G.N.; Kuibeda, R.P.; Kulevoy, T.V.; Masunov, E.S.; Oks, E.M.; Pershin, V.I.; Polozov, S.M.; Poole, H.J.; Seleznev, D.N.; Storozhenko, P.A.; Vizir, A.; Svarovski, A.Ya.; Yakushin, P.; Yushkov, G.Yu.

    2010-06-06

    For the past seven years a joint research and development effort focusing on the design of steady state, intense ion sources has been in progress with the ultimate goal being to meet the two, energy extreme range needs of mega-electron-volt and 100's of electron-volt ion implanters. However, since the last Fortier is low energy ion implantation, focus of the endeavor has shifted to low energy ion implantation. For boron cluster source development, we started with molecular ions of decaborane (B{sub 10}H{sub 14}), octadecaborane (B{sub 18}H{sub 22}), and presently our focus is on carborane (C{sub 2}B{sub 10}H{sub 12}) ions developing methods for mitigating graphite deposition. Simultaneously, we are developing a pure boron ion source (without a working gas) that can form the basis for a novel, more efficient, plasma immersion source. Our Calutron-Berna ion source was converted into a universal source capable of switching between generating molecular phosphorous P{sub 4}{sup +}, high charge state ions, as well as other types of ions. Additionally, we have developed transport systems capable of transporting a very large variety of ion species, and simulations of a novel gasless/plasmaless ion beam deceleration method were also performed.

  4. Desorption of cluster ions from solid Ne by low-energy ion impact.

    PubMed

    Tachibana, T; Fukai, K; Koizumi, T; Hirayama, T

    2010-12-01

    We investigated Ne(+) ions and Ne(n)(+) (n = 2-20) cluster ions desorbed from the surface of solid Ne by 1.0 keV Ar(+) ion impact. Kinetic energy analysis shows a considerably narrower energy distribution for Ne(n)(+) (n ≥ 3) ions than for Ne(n)(+) (n = 1, 2) ions. The dependence of ion yields on Ne film thickness indicates that cluster ions (n ≥ 3) are desorbed only from relatively thick films. We conclude that desorbed ions grow into large cluster ions during the outflow of deep bulk atoms to the vacuum.

  5. An angled nano-tunnel fabricated on poly(methyl methacrylate) by a focused ion beam

    NASA Astrophysics Data System (ADS)

    Her, Eun Kyu; Chung, Hee-Suk; Moon, Myoung-Woon; Oh, Kyu Hwan

    2009-07-01

    Angled nano-scale tunnels with high aspect ratio were fabricated on poly(methyl methacrylate) (PMMA) using a focused ion beam (FIB). The fabrication parameters such as ion fluence, incidence angle, and acceleration voltage of the Ga+ ion beam were first studied on the PMMA surface to explore the formation of the nano-scale configurations such as nano-holes and cones with diameter in the range of 50-150 nm at an ion beam acceleration voltage of 5-20 kV. It was also found that the PMMA surface exposed to FIB was changed into an amorphous graphitic structure. Angled nano-scale tunnels were fabricated with high aspect ratio of 700-1500 nm in depth and 60 nm in mean diameter at an ion beam acceleration voltage of 5 kV and under a specific ion beam current. The angle of the nano-tunnels was found to follow the incident angle of the ion beam tilted from 0° to 85°, which has the potential for creating a mold for anisotropic adhesives by mimicking the hairs on a gecko's feet.

  6. Molecular dynamics simulation of ion focusing and crowdion formation in self-ion-irradiated Fe

    NASA Astrophysics Data System (ADS)

    Chen, Di; Shao, Lin

    2012-02-01

    We have used molecular dynamics (MD) simulation to investigate damage and defect development in a <1 0 0> Fe substrate upon 2 keV Fe ion bombardment. The damage cascade formation is accompanied by atomic shifting over a limited distance along the direction of one atomic row, which leads to formation of crowdions aligned with <1 1 1> direction. At the end of structural relaxation and defect recombination, crowdions lead to formation of dumbbell defects - a type of vacancy-interstitial complexes having one vacancy between a pair of slightly displaced interstitials. The dumbbell defects are initially oriented along <1 1 1> direction. After a typical period of 0.2 ps, some dumbbell defects rotate towards <1 1 0> direction. Crowdion and dumbbell defect formation influence the time dependent damage buildups.

  7. Controlling the nanodot formation on GaAs surface during focused ion beam processing

    NASA Astrophysics Data System (ADS)

    Dhamodaran, S.; Ramkumar, J.

    2010-12-01

    GaAs processed using gallium-focused ion beams for the fabrication of photonic devices mostly results in gallium nanodots on the surface. These gallium nanodots may produce unwanted effects and deteriorate the optical and electrical properties of the devices. We have investigated the FIB processing of GaAs with and without exposure to an insulator-enhanced etching precursor gas (XeF2) to explore the use of XeF2 during GaAs processing. It is reported that without the gas, FIB processing results in nanodots on the surface that vary in size and density depending on processing parameters such as incident energy, beam current, angle and dwell time. Processing with insulator (XeF2)-enhanced etching gas irrespective of the process parameters eliminates the nanodots and results in a smooth surface, as characterized by scanning electron microscopy and atomic force microscopy. This method will be useful for surfaces which require dry processing without exposure to any wet chemical etching.

  8. Direct patterning of gold oxide thin films by focused ion-beam irradiation

    NASA Astrophysics Data System (ADS)

    Machalett, F.; Edinger, K.; Melngailis, J.; Diegel, M.; Steenbeck, K.; Steinbeiss, E.

    For direct writing of electrically conducting connections and areas into insulating gold oxide thin films a scanning Ar+ laser beam and a 30 keV Ga+ focused ion beam (FIB) have been used. The gold oxide films are prepared by magnetron sputtering under argon/oxygen plasma. The patterning of larger areas (dimension 10-100 μm) has been carried out with the laser beam by local heating of the selected area above the decomposition temperature of AuOx (130-150 °C). For smaller dimensions (100 nm to 10 μm) the FIB irradiation could be used. With both complementary methods a reduction of the sheet resistance by 6-7 orders of magnitude has been achieved in the irradiated regions (e.g. with FIB irradiation from 1.5×107 Ω/□ to approximately 6 Ω/□). The energy-dispersive X-ray analysis (EDX) show a considerably reduced oxygen content in the irradiated areas, and scanning electron microscopy (SEM), as well as atomic force microscopy (AFM) investigations, indicate that the FIB patterning in the low-dose region (1014 Ga+/cm2) is combined with a volume reduction, which is caused by oxygen escape rather than by sputtering.

  9. Site-selective local fluorination of graphene induced by focused ion beam irradiation

    PubMed Central

    Li, Hu; Daukiya, Lakshya; Haldar, Soumyajyoti; Lindblad, Andreas; Sanyal, Biplab; Eriksson, Olle; Aubel, Dominique; Hajjar-Garreau, Samar; Simon, Laurent; Leifer, Klaus

    2016-01-01

    The functionalization of graphene remains an important challenge for numerous applications expected by this fascinating material. To keep advantageous properties of graphene after modification or functionalization of its structure, local approaches are a promising road. A novel technique is reported here that allows precise site-selective fluorination of graphene. The basic idea of this approach consists in the local radicalization of graphene by focused ion beam (FIB) irradiation and simultaneous introduction of XeF2 gas. A systematic series of experiments were carried out to outline the relation between inserted defect creation and the fluorination process. Based on a subsequent X-ray photoelectron spectroscopy (XPS) analysis, a 6-fold increase of the fluorine concentration on graphene under simultaneous irradiation was observed when compared to fluorination under normal conditions. The fluorine atoms are predominately localized at the defects as indicated from scanning tunneling microscopy (STM). The experimental findings are confirmed by density functional theory which predicts a strong increase of the binding energy of fluorine atoms when bound to the defect sites. The developed technique allows for local fluorination of graphene without using resists and has potential to be a general enabler of site-selective functionalization of graphene using a wide range of gases. PMID:26822900

  10. Electrostatic energy analyzer measurements of low energy zirconium beam parameters in a plasma sputter-type negative ion source.

    PubMed

    Malapit, Giovanni M; Mahinay, Christian Lorenz S; Poral, Matthew D; Ramos, Henry J

    2012-02-01

    A plasma sputter-type negative ion source is utilized to produce and detect negative Zr ions with energies between 150 and 450 eV via a retarding potential-type electrostatic energy analyzer. Traditional and modified semi-cylindrical Faraday cups (FC) inside the analyzer are employed to sample negative Zr ions and measure corresponding ion currents. The traditional FC registered indistinct ion current readings which are attributed to backscattering of ions and secondary electron emissions. The modified Faraday cup with biased repeller guard ring, cut out these signal distortions leaving only ringings as issues which are theoretically compensated by fitting a sigmoidal function into the data. The mean energy and energy spread are calculated using the ion current versus retarding potential data while the beam width values are determined from the data of the transverse measurement of ion current. The most energetic negative Zr ions yield tighter energy spread at 4.11 eV compared to the least energetic negative Zr ions at 4.79 eV. The smallest calculated beam width is 1.04 cm for the negative Zr ions with the highest mean energy indicating a more focused beam in contrast to the less energetic negative Zr ions due to space charge forces.

  11. Electrostatic energy analyzer measurements of low energy zirconium beam parameters in a plasma sputter-type negative ion source

    SciTech Connect

    Malapit, Giovanni M.; Mahinay, Christian Lorenz S.; Poral, Matthew D.; Ramos, Henry J.

    2012-02-15

    A plasma sputter-type negative ion source is utilized to produce and detect negative Zr ions with energies between 150 and 450 eV via a retarding potential-type electrostatic energy analyzer. Traditional and modified semi-cylindrical Faraday cups (FC) inside the analyzer are employed to sample negative Zr ions and measure corresponding ion currents. The traditional FC registered indistinct ion current readings which are attributed to backscattering of ions and secondary electron emissions. The modified Faraday cup with biased repeller guard ring, cut out these signal distortions leaving only ringings as issues which are theoretically compensated by fitting a sigmoidal function into the data. The mean energy and energy spread are calculated using the ion current versus retarding potential data while the beam width values are determined from the data of the transverse measurement of ion current. The most energetic negative Zr ions yield tighter energy spread at 4.11 eV compared to the least energetic negative Zr ions at 4.79 eV. The smallest calculated beam width is 1.04 cm for the negative Zr ions with the highest mean energy indicating a more focused beam in contrast to the less energetic negative Zr ions due to space charge forces.

  12. Quantum energy teleportation with trapped ions

    SciTech Connect

    Hotta, Masahiro

    2009-10-15

    We analyze a protocol of quantum energy teleportation that transports energy from the left edge of a linear ion crystal to the right edge by local operations and classical communication at a speed considerably greater than the speed of a phonon in the crystal. A probe qubit is strongly coupled with phonon fluctuation in the ground state for a short time and it is projectively measured in order to obtain information about this phonon fluctuation. During the measurement process, phonons are excited by the time-dependent measurement interaction and the energy of the excited phonons must be infused from outside the system. The obtained information is transferred to the right edge of the crystal through a classical channel. Even though the phonons excited at the left edge do not arrive at the right edge at the same time as when the information arrives at the right edge, we are able to soon extract energy from the ions at the right edge by using the transferred information. Because the intermediate ions of the crystal are not excited during the execution of the protocol, energy is transmitted in the energy-transfer channel without heat generation.

  13. Ion channels in the central regulation of energy and glucose homeostasis

    PubMed Central

    Sohn, Jong-Woo

    2013-01-01

    Ion channels are critical regulators of neuronal excitability and synaptic function in the brain. Recent evidence suggests that ion channels expressed by neurons within the brain are responsible for regulating energy and glucose homeostasis. In addition, the central effects of neurotransmitters and hormones are at least in part achieved by modifications of ion channel activity. This review focuses on ion channels and their neuronal functions followed by a discussion of the identified roles for specific ion channels in the central pathways regulating food intake, energy expenditure, and glucose balance. PMID:23734095

  14. Focus on Energy: Schools Asked for Help in Energy Study

    ERIC Educational Resources Information Center

    Anderson, Carl R.; Stanley, Preston O.

    1975-01-01

    Describes procedures to be followed in a national survey of energy use and conservation in the public schools. A series of policy options will be developed from the information acquired from the survey. (Published by Association of School Business Officers, 2424 W. Lawrence Ave., Chicago, Illinois 60625) (Author/DN)

  15. An electrostatic quadrupole doublet focusing system for MeV heavy ions in MeV-SIMS

    NASA Astrophysics Data System (ADS)

    Seki, T.; Shitomoto, S.; Nakagawa, S.; Aoki, T.; Matsuo, J.

    2013-11-01

    The importance of imaging mass spectrometry (MS) for visualizing the spatial distribution of molecular species in biological tissues and cells is growing. In conventional SIMS with keV-energy ion beams, elastic collisions occur between projectiles and atoms in constituent molecules. The collisions produce fragments, making acquisition of molecular information difficult. In contrast, MeV-energy ion beams excite electrons near the surface and enhance the ionization of high-mass molecules, hence, fragment suppressed SIMS spectrum of ionized molecules can be obtained. This work is a further step on our previous report on the successful development of a MeV secondary ion mass spectrometry (MeV-SIMS) for biological samples. We have developed an electrostatic quadrupole doublet (EQ doublet) focusing system, made of two separate lenses, Q1 and Q2, to focus the MeV heavy ion beam and reduce measurement time. A primary beam of 6 MeV Cu4+ was focused with this EQ doublet. We applied 1120 V to the Q1 lens and 1430 V to the Q2 lens, and the current density increased by a factor of about 60. Using this arrangement, we obtained an MeV-SIMS image of 100 × 100 pixels of cholesterol-OH+ of cerebellum (m/z = 369.3) over a 4 mm × 4 mm field of view, with a pixel size of 40 μm within 5 min, showing that our EQ doublet reduces the measurement time of current imaging by a factor of about 30.

  16. Study on electron beam in a low energy plasma focus

    SciTech Connect

    Khan, Muhammad Zubair; Ling, Yap Seong; San, Wong Chiow

    2014-03-05

    Electron beam emission was investigated in a low energy plasma focus device (2.2 kJ) using copper hollow anode. Faraday cup was used to estimate the energy of the electron beam. XR100CR X-ray spectrometer was used to explore the impact of the electron beam on the target observed from top-on and side-on position. Experiments were carried out at optimized pressure of argon gas. The impact of electron beam is exceptionally notable with two different approaches using lead target inside hollow anode in our plasma focus device.

  17. Giant magnetoresistance in Co/Cu multilayers fabricated by focused ion-beam direct deposition

    NASA Astrophysics Data System (ADS)

    Nagamachi, Shinji; Ueda, Masahiro; Sakakima, Hiroshi; Satomi, Mitsuo; Ishikawa, Junzo

    1996-10-01

    We report the direct deposition of patterned multilayers that exhibit giant magnetoresistance without any lithographic processes. We fabricated Co/Cu multilayers by the focused ion-beam direct deposition method and measured the magnetoresistance characteristics of the multilayers. The fabricated Co/Cu multilayers are 14×76 μm2 in size and consist of 12 layers of Co thin film with the thickness of 20 Å and 11 layers of Cu thin film with the thickness of 13-22 Å on the GaAs substrate. We used a 108 eV Co2+ ion beam and 54 eV Cu+ ion beam extracted from a Co-Cu-Au-Nb alloy ion source. The measured magnetoresistance ratio of giant magnetoresistance was 6.7% in the case of the Co(20 Å)/Cu(21 Å) multilayer. Experimental results show precise controllability of the thickness and the additional capability of the focused ion-beam direct deposition method.

  18. Controlled fabrication of nanopores using a direct focused ion beam approach with back face particle detection

    NASA Astrophysics Data System (ADS)

    Patterson, N.; Adams, D. P.; Hodges, V. C.; Vasile, M. J.; Michael, J. R.; Kotula, P. G.

    2008-06-01

    We report a direct, ion drilling technique that enables the reproducible fabrication and placement of nanopores in membranes of different thickness. Using a 30 keV focused Ga ion beam column combined with an in situ, back face, multi-channelplate particle detector, nanopores are sputtered in Si3N4 and W/Si3N4 to have diameters as small as 12 nm. Transmission electron microscopy shows that focused ion beam-drilled holes are near-conical with the diameter decreasing from entry to exit side. By monitoring the detector signal during ion exposure, the drilled hole width can be minimized such that the exit-side diameter is smaller than the full width at half-maximum of the nominally Gaussian-shaped incident beam. Judicious choice of the beam defining aperture combined with back face particle detection allows for reproducible exit-side hole diameters between 18 and 100 nm. The nanopore direct drilling technique does not require potentially damaging broad area exposure to tailor hole sizes. Moreover, this technique successfully achieves breakthrough despite the effects of varying membrane thickness, redeposition, polycrystalline grain structure, and slight ion beam current fluctuations.

  19. Controlled fabrication of nanopores using a direct focused ion beam approach with back face particle detection.

    PubMed

    Patterson, N; Adams, D P; Hodges, V C; Vasile, M J; Michael, J R; Kotula, P G

    2008-06-11

    We report a direct, ion drilling technique that enables the reproducible fabrication and placement of nanopores in membranes of different thickness. Using a 30 keV focused Ga ion beam column combined with an in situ, back face, multi-channelplate particle detector, nanopores are sputtered in Si(3)N(4) and W/Si(3)N(4) to have diameters as small as 12 nm. Transmission electron microscopy shows that focused ion beam-drilled holes are near-conical with the diameter decreasing from entry to exit side. By monitoring the detector signal during ion exposure, the drilled hole width can be minimized such that the exit-side diameter is smaller than the full width at half-maximum of the nominally Gaussian-shaped incident beam. Judicious choice of the beam defining aperture combined with back face particle detection allows for reproducible exit-side hole diameters between 18 and 100 nm. The nanopore direct drilling technique does not require potentially damaging broad area exposure to tailor hole sizes. Moreover, this technique successfully achieves breakthrough despite the effects of varying membrane thickness, redeposition, polycrystalline grain structure, and slight ion beam current fluctuations. PMID:21825787

  20. Dynamic Faraday cup signal analysis and the measurement of energetic ions emitted by plasma focus

    SciTech Connect

    Pestehe, S. J. Mohammadnejad, M.; Irani Mobaraki, S.

    2014-03-15

    A theoretical model is developed to study the signals from a typical dynamic Faraday cup, and using this model the output signals from this structure are obtained. A detailed discussion on the signal structure, using different experimental conditions, is also given. It is argued that there is a possibility of determining the total charge of the generated ion pulse, the maximum velocity of the ions, ion velocity distribution, and the number of ion species for mixed working gases, under certain conditions. In addition, the number of different ionization stages, the number of different pinches in one shot, and the number of different existing acceleration mechanisms can also be determined provided that the mentioned conditions being satisfied. An experiment is carried out on the Filippov type 90 kJ Sahand plasma focus using Ar as the working gas at the pressure of 0.25 Torr. The data from a typical shot are fitted to a signal from the model and the total charge of the related energetic ion pulse is deduced using the values of the obtained fit parameters. Good agreement between the obtained amount of the total charge and the values obtained during other experiments on the same plasma focus device is observed.

  1. Synthesis of nanowires via helium and neon focused ion beam induced deposition with the gas field ion microscope.

    PubMed

    Wu, H M; Stern, L A; Chen, J H; Huth, M; Schwalb, C H; Winhold, M; Porrati, F; Gonzalez, C M; Timilsina, R; Rack, P D

    2013-05-01

    The ion beam induced nanoscale synthesis of platinum nanowires using the trimethyl (methylcyclopentadienyl)platinum(IV) (MeCpPt(IV)Me3) precursor is investigated using helium and neon ion beams in the gas field ion microscope. The He(+) beam induced deposition resembles material deposited by electron beam induced deposition with very small platinum nanocrystallites suspended in a carbonaceous matrix. The He(+) deposited material composition was estimated to be 16% Pt in a matrix of amorphous carbon with a large room-temperature resistivity (∼3.5 × 10(4)-2.2 × 10(5) μΩ cm) and temperature-dependent transport behavior consistent with a granular material in the weak intergrain tunnel coupling regime. The Ne(+) deposited material has comparable composition (17%), however a much lower room-temperature resistivity (∼600-3.0 × 10(3) μΩ cm) and temperature-dependent electrical behavior representative of strong intergrain coupling. The Ne(+) deposited nanostructure has larger platinum nanoparticles and is rationalized via Monte Carlo ion-solid simulations which show that the neon energy density deposited during growth is much larger due to the smaller ion range and is dominated by nuclear stopping relative to helium which has a larger range and is dominated by electronic stopping.

  2. Sampling of ions at atmospheric pressure: ion transmission and ion energy studied by simulation and experiment

    NASA Astrophysics Data System (ADS)

    Große-Kreul, Simon; Hübner, Simon; Benedikt, Jan; von Keudell, Achim

    2016-04-01

    Mass spectrometry of ions from atmospheric pressure plasmas is a challenging diagnostic method that has been applied to a large variety of cold plasma sources in the past. However, absolute densities can usually not be obtained, moreover, the process of sampling of ions and neutrals from such a plasma inherently influences the measured composition. These issues are studied in this contribution by a combination of experimental and numerical methods. Different numerical domains are sequentially coupled to calculate the ion transmission from the source to the mass analyzer. It is found that the energy of the sampled ions created by a radio-frequency microplasma operated in a He-N2 mixture at atmospheric pressure is of the order of 0.1 eV and that it depends linearly on the ion mass in good agreement with the expectation for seeded particles accelerated in a supersonic expansion. Moreover, the measured ion energy distribution from an afterglow of an atmospheric pressure plasma can be reproduced on basis of the particle trajectories in the sampling system. Eventually, an estimation of the absolute flux of ions to the detector is deduced.

  3. Applied Focused Ion Beam Techniques for Sample Preparation of Astromaterials for Integrated Nano-Analysis

    SciTech Connect

    Graham, G A; Teslich, N E; Kearsley, A T; Stadermann, F J; Stroud, R M; Dai, Z R; Ishii, H A; Hutcheon, I D; Bajt, S; Snead, C J; Weber, P K; Bradley, J P

    2007-02-20

    Sample preparation is always a critical step in study of micrometer sized astromaterials available for study in the laboratory, whether their subsequent analysis is by electron microscopy or secondary ion mass spectrometry. A focused beam of gallium ions has been used to prepare electron transparent sections from an interplanetary dust particle, as part of an integrated analysis protocol to maximize the mineralogical, elemental, isotopic and spectroscopic information extracted from one individual particle. In addition, focused ion beam techniques have been employed to extract cometary residue preserved on the rims and walls of micro-craters in 1100 series aluminum foils that were wrapped around the sample tray assembly on the Stardust cometary sample collector. Non-ideal surface geometries and inconveniently located regions of interest required creative solutions. These include support pillar construction and relocation of a significant portion of sample to access a region of interest. Serial sectioning, in a manner similar to ultramicrotomy, is a significant development and further demonstrates the unique capabilities of focused ion beam microscopy for sample preparation of astromaterials.

  4. Envelope model for passive magnetic focusing of an intense proton or ion beam propagating through thin foils

    NASA Astrophysics Data System (ADS)

    Lund, Steven M.; Cohen, Ronald H.; Ni, Pavel A.

    2013-04-01

    Ion beams (including protons) with low emittance and high space-charge intensity can be propagated with normal incidence through a sequence of thin metallic foils separated by vacuum gaps of order the characteristic transverse beam extent to transport/collimate the beam or to focus it to a small transverse spot. Energetic ions have sufficient range to pass through a significant number of thin foils with little energy loss or scattering. The foils reduce the (defocusing) radial electric self-field of the beam while not altering the (focusing) azimuthal magnetic self-field of the beam, thereby allowing passive self-beam focusing if the magnetic field is sufficiently strong relative to the residual electric field. Here we present an envelope model developed to predict the strength of this passive (beam generated) focusing effect under a number of simplifying assumptions including relatively long pulse duration. The envelope model provides a simple criterion for the necessary foil spacing for net focusing and clearly illustrates system focusing properties for either beam collimation (such as injecting a laser-produced proton beam into an accelerator) or for magnetic pinch focusing to a small transverse spot (for beam driven heating of materials). An illustrative example is worked for an idealization of a recently performed laser-produced proton-beam experiment to provide guidance on possible beam focusing and collimation systems. It is found that foils spaced on the order of the characteristic transverse beam size desired can be employed and that envelope divergence of the initial beam entering the foil lens must be suppressed to limit the total number of foils required to practical values for pinch focusing. Relatively modest proton-beam current at 10 MeV kinetic energy can clearly demonstrate strong magnetic pinch focusing achieving a transverse rms extent similar to the foil spacing (20-50μm gaps) in beam propagation distances of tens of mm. This is a surprisingly

  5. Percolation of gallium dominates the electrical resistance of focused ion beam deposited metals

    SciTech Connect

    Faraby, H.; DiBattista, M.; Bandaru, P. R.

    2014-04-28

    Metal deposition through focused ion beam (FIB) based systems is thought to result in material composed of the primary metal from the metallo-organic precursor in addition to carbon, oxygen, and gallium. We determined, through electrical resistance and chemical composition measurements on a wide range of FIB deposited platinum and tungsten lines, that the gallium ion (Ga{sup +}) concentration in the metal lines plays the dominant role in controlling the electrical resistivity. Effective medium theory, based on McLachlan's formalisms, was used to describe the relationship between the Ga{sup +} concentration and the corresponding resistivity.

  6. Focused ion-beam writing of channel waveguides in bismuth germanate crystal for telecommunication bands

    NASA Astrophysics Data System (ADS)

    He, Ruiyun; Vanga, Sudheer Kumar; Bettiol, Andrew A.; Chen, Feng

    2015-05-01

    We report on the fabrication of channel waveguides in bismuth germanate (BGO) crystal using focused ion-beam writing. 1 and 2 MeV He+ ions with different fluences are utilized to directly write waveguides in BGO crystal. The guiding properties of the BGO waveguides are explored at the wavelengths of 632.8 nm, 1.31 μm and 1.55 μm, showing that the channel waveguides support light guidance from visible to telecommunication bands along both transverse-electric and transverse-magnetic polarizations.

  7. Precise milling of nano-gap chains in graphene with a focused helium ion beam

    NASA Astrophysics Data System (ADS)

    Zhou, Yangbo; Maguire, Pierce; Jadwiszczak, Jakub; Muruganathan, Manoharan; Mizuta, Hiroshi; Zhang, Hongzhou

    2016-08-01

    A focused helium ion beam was used to introduce nano-sized gap chains in graphene. The effect of beam scanning strategies in the fabrication of the nano-gap chains was investigated. The tuning of graphene conductivity has been achieved by modulating the magnitude and uniformity of the ion dose and hence the morphology of the nano-gap chains. A model based on the site-specific and dose-dependent conductivity was built to understand the tuning of the conductivity, taking into account the nanoscale non-uniformity of irradiation.

  8. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics.

    PubMed

    Stevens-Kalceff, Marion A; Levick, Katie J

    2007-03-01

    Energetic beams of electrons and ions are widely used to probe the microscopic properties of materials. Irradiation with charged beams in scanning electron microscopes (SEM) and focused ion beam (FIB) systems may result in the trapping of charge at irradiation induced or pre-existing defects within the implanted microvolume of the dielectric material. The significant perturbing influence on dielectric materials of both electron and (Ga(+)) ion beam irradiation is assessed using scanning probe microscopy (SPM) techniques. Kelvin Probe Microscopy (KPM) is an advanced SPM technique in which long-range Coulomb forces between a conductive atomic force probe and the silicon dioxide specimen enable the potential at the specimen surface to be characterized with high spatial resolution. KPM reveals characteristic significant localized potentials in both electron and ion implanted dielectrics. The potentials are observed despite charge mitigation strategies including prior coating of the dielectric specimen with a layer of thin grounded conductive material. Both electron- and ion-induced charging effects are influenced by a delicate balance of a number of different dynamic processes including charge-trapping and secondary electron emission. In the case of ion beam induced charging, the additional influence of ion implantation and nonstoichiometric sputtering from compounds is also important. The presence of a localized potential will result in the electromigration of mobile charged defect species within the irradiated volume of the dielectric specimen. This electromigration may result in local modification of the chemical composition of the irradiated dielectric. The implications of charging induced effects must be considered during the microanalysis and processing of dielectric materials using electron and ion beam techniques.

  9. Formation of self-assembled Ga-rich droplet chains on GaAs (100) patterned by focused ion beam

    NASA Astrophysics Data System (ADS)

    Koukourinkova, Sabina D.; Benamara, Mourad; Ware, Morgan E.; Wang, Zhiming M.; Salamo, Gregory J.

    2016-09-01

    Controlled positioning and ordering of uniform self-assembled droplets on a patterned GaAs (100) substrate is demonstrated using a Ga+ focused ion beam. The arrangement of the droplets into an array of droplet chains is induced by changes in the surface morphology during irradiation as a function of sputtering time. Energy dispersive x-ray spectroscopy reveals that the droplets are Ga-rich. The patterned surface may be of interest for plasmonic studies and may find application as a template for site-specific epitaxial growth of unstrained quantum dot chains utilizing local droplet etching and droplet epitaxy techniques.

  10. Ion beam and neutron output from a sub-kilojoule dense plasma focus

    NASA Astrophysics Data System (ADS)

    Ellsworth, J. L.; Falabella, S.; Schmidt, A.; Tang, V.

    2014-12-01

    We are seeking to gain a better fundamental understanding of the ion beam acceleration and neutron production dense plasma focus (DPF) device. Experiments were performed on a kilojoule level, fast rise time DPF located at LLNL. Ion beam spectra and neutron yield were measured for deuterium pinches. Visible light images of the pinch are used to determine the pinch length. In addition, an RF probe was placed just outside the cathode to measure fluctuations in Ez up to 6 GHz, which is within the range of the lower hybrid frequencies. We find these oscillations arise at a characteristic frequency near 4 GHz during the pinch. Comparisons of the neutron yield and ion beam characteristics are presented. The neutron yield is also compared to scaling laws.

  11. Ion beam and neutron output from a sub-kilojoule dense plasma focus

    SciTech Connect

    Ellsworth, J. L. Falabella, S. Schmidt, A. Tang, V.

    2014-12-15

    We are seeking to gain a better fundamental understanding of the ion beam acceleration and neutron production dense plasma focus (DPF) device. Experiments were performed on a kilojoule level, fast rise time DPF located at LLNL. Ion beam spectra and neutron yield were measured for deuterium pinches. Visible light images of the pinch are used to determine the pinch length. In addition, an RF probe was placed just outside the cathode to measure fluctuations in E{sub z} up to 6 GHz, which is within the range of the lower hybrid frequencies. We find these oscillations arise at a characteristic frequency near 4 GHz during the pinch. Comparisons of the neutron yield and ion beam characteristics are presented. The neutron yield is also compared to scaling laws.

  12. Focused ion beam induced microstructural alterations: texture development, grain growth, and intermetallic formation.

    PubMed

    Michael, Joseph R

    2011-06-01

    Copper, gold, and tungsten thin films have been exposed to 30 kV Ga+ ion irradiation, and the resulting microstructural modifications are studied as a function of ion dose. The observed microstructural changes include texture development with respect to the easy channeling direction in the target, and in the case of Cu, an additional intermetallic phase is produced. Texture development in these target materials is a function of the starting materials grain size, and these changes are not observed in large grained materials. The accepted models of differential damage driven grain growth are not supported by the results of this study. The implications of this study to the use of focused ion beam tools for sample preparation are discussed. PMID:21466753

  13. Silicon Oxide Deposition into a Hole Using a Focused Ion Beam

    NASA Astrophysics Data System (ADS)

    Nakamura, Hiroko; Komano, Haruki; Norimatu, Kenji; Gomei, Yoshio

    1991-11-01

    Focused ion beam (FIB)-induced deposition of silicon oxide in terms of filling a hole is reported. It was found that a vacant space was formed when an ion beam was simply scanned through the hole area. To investigate the mechanism to form the vacancy, deposition on the sample, which has a step with a height of 0.8 μm, was carried out by using a Si2+ and a Be2+ ion beam. An extruded deposit resembling a pent roof was observed from the step ridge. The mechanism of the pent roof growth on the steplike sample was considered and the vacancy formation in the hole can be explained by the same mechanism. For silicon oxide, the high growth rate of the extruded deposit is thought to be the key to the vacancy formation. A useful way is proposed to fill the hole with silicon oxide with almost no vacancy.

  14. Microstructural tomography of a Ni(70)Cr(20)Al(10) superalloy using focused ion beam microscopy.

    PubMed

    Uchic, M D; De Graef, M; Wheeler, R; Dimiduk, D M

    2009-09-01

    A focused ion beam (FIB) microscope has been used to simultaneously depth profile and image the gamma-gamma' microstructure of a nickel base superalloy using normal incidence milling in order to characterize the precipitate microstructure in three dimensions (3D). The normal incidence milling rates of the gamma and gamma' phases in this alloy are closely matched when the orientation of the depth-profiled surface is near 001, which allows for uniform material removal to depths up to a couple of microns. Depth-profiling experiments consisted of automated ion milling and collection of ion-generated secondary-electron images at specified intervals, and was demonstrated for a voxel resolution of roughly 15 x 15 x 16 nm(3). Image-processing software was used for automated processing of the 2D image sequence to render the gamma precipitate structure in 3D. PMID:19523769

  15. Focused ion beam induced microstructural alterations: texture development, grain growth, and intermetallic formation.

    PubMed

    Michael, Joseph R

    2011-06-01

    Copper, gold, and tungsten thin films have been exposed to 30 kV Ga+ ion irradiation, and the resulting microstructural modifications are studied as a function of ion dose. The observed microstructural changes include texture development with respect to the easy channeling direction in the target, and in the case of Cu, an additional intermetallic phase is produced. Texture development in these target materials is a function of the starting materials grain size, and these changes are not observed in large grained materials. The accepted models of differential damage driven grain growth are not supported by the results of this study. The implications of this study to the use of focused ion beam tools for sample preparation are discussed.

  16. Focused ion beam high resolution grayscale lithography for silicon-based nanostructures

    SciTech Connect

    Erdmanis, M. Tittonen, I.

    2014-02-17

    Nanofabrication techniques providing a fine control over the profile of silicon structures are of great importance for nanophotonics, plasmonics, sensing, micro- and nano fluidics, and biomedical applications. We report on the applicability of focused ion beam for the fine grayscale lithography, which yields surface profiles that are customized at nanoscale. The approach is based on a correlation between the ion beam irradiation dose of inorganic resist and the mask etching rate in the reactive ion etching. An exceptional property of this method is the number of gray tones that are not limited by the resist characteristics. We apply the process to fabricate unique periodic nanostructures with a slope angle varying across the structure and a period as small as 200 nm.

  17. Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling.

    PubMed

    Estivill, Robert; Audoit, Guillaume; Barnes, Jean-Paul; Grenier, Adeline; Blavette, Didier

    2016-06-01

    The damage and ion distribution induced in Si by an inductively coupled plasma Xe focused ion beam was investigated by atom probe tomography. By using predefined patterns it was possible to prepare the atom probe tips with a sub 50 nm end radius in the ion beam microscope. The atom probe reconstruction shows good agreement with simulated implantation profiles and interplanar distances extracted from spatial distribution maps. The elemental profiles of O and C indicate co-implantation during the milling process. The presence of small disc-shaped Xe clusters are also found in the three-dimensional reconstruction. These are attributed to the presence of Xe nanocrystals or bubbles that open during the evaporation process. The expected accumulated dose points to a loss of >95% of the Xe during analysis, which escapes undetected. PMID:27056544

  18. Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling.

    PubMed

    Estivill, Robert; Audoit, Guillaume; Barnes, Jean-Paul; Grenier, Adeline; Blavette, Didier

    2016-06-01

    The damage and ion distribution induced in Si by an inductively coupled plasma Xe focused ion beam was investigated by atom probe tomography. By using predefined patterns it was possible to prepare the atom probe tips with a sub 50 nm end radius in the ion beam microscope. The atom probe reconstruction shows good agreement with simulated implantation profiles and interplanar distances extracted from spatial distribution maps. The elemental profiles of O and C indicate co-implantation during the milling process. The presence of small disc-shaped Xe clusters are also found in the three-dimensional reconstruction. These are attributed to the presence of Xe nanocrystals or bubbles that open during the evaporation process. The expected accumulated dose points to a loss of >95% of the Xe during analysis, which escapes undetected.

  19. Structural and composition investigations at delayered locations of low k integrated circuit device by gas-assisted focused ion beam

    SciTech Connect

    Wang, Dandan Kee Tan, Pik; Yamin Huang, Maggie; Lam, Jeffrey; Mai, Zhihong

    2014-05-15

    The authors report a new delayering technique – gas-assisted focused ion beam (FIB) method and its effects on the top layer materials of integrated circuit (IC) device. It demonstrates a highly efficient failure analysis with investigations on the precise location. After removing the dielectric layers under the bombardment of an ion beam, the chemical composition of the top layer was altered with the reduced oxygen content. Further energy-dispersive x-ray spectroscopy and Fourier transform infrared analysis revealed that the oxygen reduction lead to appreciable silicon suboxide formation. Our findings with structural and composition alteration of dielectric layer after FIB delayering open up a new insight avenue for the failure analysis in IC devices.

  20. In situ nanomechanical testing in focused ion beam and scanning electron microscopes.

    PubMed

    Gianola, D S; Sedlmayr, A; Mönig, R; Volkert, C A; Major, R C; Cyrankowski, E; Asif, S A S; Warren, O L; Kraft, O

    2011-06-01

    The recent interest in size-dependent deformation of micro- and nanoscale materials has paralleled both technological miniaturization and advancements in imaging and small-scale mechanical testing methods. Here we describe a quantitative in situ nanomechanical testing approach adapted to a dual-beam focused ion beam and scanning electron microscope. A transducer based on a three-plate capacitor system is used for high-fidelity force and displacement measurements. Specimen manipulation, transfer, and alignment are performed using a manipulator, independently controlled positioners, and the focused ion beam. Gripping of specimens is achieved using electron-beam assisted Pt-organic deposition. Local strain measurements are obtained using digital image correlation of electron images taken during testing. Examples showing results for tensile testing of single-crystalline metallic nanowires and compression of nanoporous Au pillars will be presented in the context of size effects on mechanical behavior and highlight some of the challenges of conducting nanomechanical testing in vacuum environments.

  1. Genesis of focused ion beams for plasma nanotechnology using a bounded microwave plasma source

    NASA Astrophysics Data System (ADS)

    Bhattacharjee, Sudeep; Paul, Samit

    2015-01-01

    Bounded plasmas exhibit many interesting properties that are not found in plasmas of “infinite” extent such as space and astrophysical plasmas. Our studies have revealed that the dispersion properties of waves in a bounded magnetoplasma deviates considerably from the predictions of the Clemmow-Mullaly-Allis (CMA) model, giving rise to new regimes of wave propagation and absorption. This article highlights some of these interesting effects observed in experiments. One of the principal outcomes of this research is the genesis of a novel multielement focused ion beam (MEFIB) system that utilizes compact bounded plasmas in a minimum-B field to provide intense focused ion beams of a variety of elements for plasma-based nanotechnology.

  2. DBR laser with nondynamic plasma grating formed by focused ion beam implanted dopants

    NASA Technical Reports Server (NTRS)

    Boenke, Myra M.; Wu, M. C.; Wang, Shyh; Clark, William M., Jr.; Stevens, Eugene H.

    1989-01-01

    A static plasma grating has been demonstrated experimentally (Wu et al., 1988) in a large-optical-cavity focused-ion-beam-distributed-Bragg-reflector (FIB-DBR) GaAlAs/GaAs laser diode. The grating is formed by implanting stripes of dopants with a focused ion beam. The dopants ionize to form periodic fluctuations in the carrier concentration which, through the Kramers-Kronig relations, form an index grating. A model of the grating strength for optimizaton of the laser design is developed and presented. The computed results show that the coupling coefficient k can be increased by more than an order of magnitude over the 15/cm experimentally. Therefore, FIB-DBR or FIB-distributed-feedback (DFB) lasers with performance comparable to that of conventional DBR (or DFB) lasers can be expected.

  3. Micromilling of Metal Alloys with Focused Ion Beam-Fabricated Tools

    SciTech Connect

    ADAMS,DAVID P.; VASILE,M.J.; BENAVIDES,GILBERT L.; CAMPBELL,ANN N.

    1999-11-05

    This work combines focused ion beam sputtering and ultra-precision machining as a first step in fabricating microstructure in metals and alloys. Specifically, {approx}25{micro}m diameter micro-end mills are made from cobalt M42 high-speed steel and C2 micrograin tungsten carbide tool blanks by ion beam sputtering. A 20 keV focused gallium beam defines tool cutting edges having radii of curvature < 0.1{micro}m. Micro-end mills having 2, 4 and 5 cutting edges successfully machine small trenches in 6061-T4 aluminum, brass, 4340 steel and polymethyl methacrylate. Machined trench widths are approximately equal to the tool diameters and surface roughnesses (rms) are {approx}150 nm or less. Microtools are robust and operate for more than 6 hours without fracture. Results from ultra-precision machining aluminum at feed rates as high as 50 mm/minute are included.

  4. Direct core structuring of microstructured optical fibers using focused ion beam milling.

    PubMed

    Warren-Smith, Stephen C; André, Ricardo M; Perrella, Christopher; Dellith, Jan; Bartelt, Hartmut

    2016-01-11

    We demonstrate the use of focused ion beam milling to machine optical structures directly into the core of microstructured optical fibers. The particular fiber used was exposed-core microstructured optical fiber, which allowed direct access to the optically guiding core. Two different designs of Fabry-Perot cavity were fabricated and optically characterized. The first cavity was formed by completely removing a section of the fiber core, while the second cavity consisted of a shallow slot milled into the core, leaving the majority of the core intact. This work highlights the possibility of machining complex optical devices directly onto the core of microstructured optical fibers using focused ion beam milling for applications including environmental, chemical, and biological sensing. PMID:26832268

  5. Direct core structuring of microstructured optical fibers using focused ion beam milling.

    PubMed

    Warren-Smith, Stephen C; André, Ricardo M; Perrella, Christopher; Dellith, Jan; Bartelt, Hartmut

    2016-01-11

    We demonstrate the use of focused ion beam milling to machine optical structures directly into the core of microstructured optical fibers. The particular fiber used was exposed-core microstructured optical fiber, which allowed direct access to the optically guiding core. Two different designs of Fabry-Perot cavity were fabricated and optically characterized. The first cavity was formed by completely removing a section of the fiber core, while the second cavity consisted of a shallow slot milled into the core, leaving the majority of the core intact. This work highlights the possibility of machining complex optical devices directly onto the core of microstructured optical fibers using focused ion beam milling for applications including environmental, chemical, and biological sensing.

  6. THE ROLE OF CROSS-SHOCK POTENTIAL ON PICKUP ION SHOCK ACCELERATION IN THE FRAMEWORK OF FOCUSED TRANSPORT THEORY

    SciTech Connect

    Zuo, Pingbing; Zhang, Ming; Rassoul, Hamid K.

    2013-10-20

    The focused transport theory is appropriate to describe the injection and acceleration of low-energy particles at shocks as an extension of diffusive shock acceleration (DSA). In this investigation, we aim to characterize the role of cross-shock potential (CSP) originated in the charge separation across the shock ramp on pickup ion (PUI) acceleration at various types of shocks with a focused transport model. The simulation results of energy spectrum and spatial density distribution for the cases with and without CSP added in the model are compared. With sufficient acceleration time, the focused transport acceleration finally falls into the DSA regime with the power-law spectral index equal to the solution of the DSA theory. The CSP can affect the shape of the spectrum segment at lower energies, but it does not change the spectral index of the final power-law spectrum at high energies. It is found that the CSP controls the injection efficiency which is the fraction of PUIs reaching the DSA regime. A stronger CSP jump results in a dramatically improved injection efficiency. Our simulation results also show that the injection efficiency of PUIs is mass-dependent, which is lower for species with a higher mass. In addition, the CSP is able to enhance the particle reflection upstream to produce a stronger intensity spike at the shock front. We conclude that the CSP is a non-negligible factor that affects the dynamics of PUIs at shocks.

  7. Conical octopole ion guide: Design, focusing, and its application to the deposition of low energetic clusters

    SciTech Connect

    Roettgen, Martin A.; Judai, Ken; Antonietti, Jean-Marie; Heiz, Ueli; Rauschenbach, Stephan; Kern, Klaus

    2006-01-15

    A design of a radio-frequency (rf) octopole ion guide with truncated conical rods arranged in a conical geometry is presented. The performance is tested in a cluster deposition apparatus used for the soft-landing of size-selected clusters on well-characterized substrates used as a model system in heterogeneous catalysis in ultrahigh vacuum. This device allows us to focus 500 pA of a mass-selected Ni{sub 20}{sup +} cluster ion beam from 9 mm down to a spot size of 2 mm in diameter. The transmittance is 70%{+-}5% at a rf voltage of 420 V{sub pp} applied over an amateur radio transceiver with an interposed homemade amplifier-transformer circuit. An increase of the cluster density by a factor of 15 has been achieved. Three ion trajectories are simulated by using SIMION6, which are relevant for this focusing device: transmitted, reflected, and absorbed. The observed effects in the simulations can be successfully explained by the adiabatic approximation. The focusing behavior of the conical octopole lens is demonstrated by experiment and simulations to be a very useful technique for increasing molecule or cluster densities on a substrate and thus reducing deposition time.

  8. Performance predictions of a focused ion beam from a laser cooled and compressed atomic beam

    SciTech Connect

    Haaf, G. ten; Wouters, S. H. W.; Vredenbregt, E. J. D.; Mutsaers, P. H. A.; Geer, S. B. van der

    2014-12-28

    Focused ion beams are indispensable tools in the semiconductor industry because of their ability to image and modify structures at the nanometer length scale. Here, we report on performance predictions of a new type of focused ion beam based on photo-ionization of a laser cooled and compressed atomic beam. Particle tracing simulations are performed to investigate the effects of disorder-induced heating after ionization in a large electric field. They lead to a constraint on this electric field strength which is used as input for an analytical model which predicts the minimum attainable spot size as a function of, amongst others, the flux density of the atomic beam, the temperature of this beam, and the total current. At low currents (I < 10 pA), the spot size will be limited by a combination of spherical aberration and brightness, while at higher currents, this is a combination of chromatic aberration and brightness. It is expected that a nanometer size spot is possible at a current of 1 pA. The analytical model was verified with particle tracing simulations of a complete focused ion beam setup. A genetic algorithm was used to find the optimum acceleration electric field as a function of the current. At low currents, the result agrees well with the analytical model, while at higher currents, the spot sizes found are even lower due to effects that are not taken into account in the analytical model.

  9. Compact electrostatic beam optics for multi-element focused ion beams: simulation and experiments.

    PubMed

    Mathew, Jose V; Bhattacharjee, Sudeep

    2011-01-01

    Electrostatic beam optics for a multi-element focused ion beam (MEFIB) system comprising of a microwave multicusp plasma (ion) source is designed with the help of two widely known and commercially available beam simulation codes: AXCEL-INP and SIMION. The input parameters to the simulations are obtained from experiments carried out in the system. A single and a double Einzel lens system (ELS) with and without beam limiting apertures (S) have been investigated. For a 1 mm beam at the plasma electrode aperture, the rms emittance of the focused ion beam is found to reduce from ∼0.9 mm mrad for single ELS to ∼0.5 mm mrad for a double ELS, when S of 0.5 mm aperture size is employed. The emittance can be further improved to ∼0.1 mm mrad by maintaining S at ground potential, leading to reduction in beam spot size (∼10 μm). The double ELS design is optimized for different electrode geometrical parameters with tolerances of ±1 mm in electrode thickness, electrode aperture, inter electrode distance, and ±1° in electrode angle, providing a robust design. Experimental results obtained with the double ELS for the focused beam current and spot size, agree reasonably well with the simulations.

  10. Compact electrostatic beam optics for multi-element focused ion beams: Simulation and experiments

    SciTech Connect

    Mathew, Jose V.; Bhattacharjee, Sudeep

    2011-01-15

    Electrostatic beam optics for a multi-element focused ion beam (MEFIB) system comprising of a microwave multicusp plasma (ion) source is designed with the help of two widely known and commercially available beam simulation codes: AXCEL-INP and SIMION. The input parameters to the simulations are obtained from experiments carried out in the system. A single and a double Einzel lens system (ELS) with and without beam limiting apertures (S) have been investigated. For a 1 mm beam at the plasma electrode aperture, the rms emittance of the focused ion beam is found to reduce from {approx}0.9 mm mrad for single ELS to {approx}0.5 mm mrad for a double ELS, when S of 0.5 mm aperture size is employed. The emittance can be further improved to {approx}0.1 mm mrad by maintaining S at ground potential, leading to reduction in beam spot size ({approx}10 {mu}m). The double ELS design is optimized for different electrode geometrical parameters with tolerances of {+-}1 mm in electrode thickness, electrode aperture, inter electrode distance, and {+-}1{sup o} in electrode angle, providing a robust design. Experimental results obtained with the double ELS for the focused beam current and spot size, agree reasonably well with the simulations.

  11. Interaction between Low Energy Ions and the Complicated Organism

    NASA Astrophysics Data System (ADS)

    Yu, Zeng-liang

    1999-12-01

    Low energy ions exist widely in natural world, but people pay a little attention on the interaction between low energy ions and matter, it is even more out of the question of studying on the relation of low energy ions and the complicated organism. The discovery of bioeffect induced by ion implantation has, however, opened a new branch in the field of ion beam application in life sciences. This paper reports recent advances in research on the role of low energy ions in chemical synthesis of the biomolecules and application in genetic modification.

  12. Reorganization at Oryx Energy focuses on teamwork, technology

    SciTech Connect

    Box, J.W. )

    1993-11-08

    As one of the largest independent oil and gas companies in the world, Oryx Energy Co. has become a strong international player, In an increasingly global business, they are competing with some very tough international companies. This competition calls for their continued focus on technology and innovative ways of conducting business, not only on the international scene but also in the U.S. Here the author focuses on ways his company is approaching U.S. activities, both onshore and in the Gulf of Mexico.

  13. Water fragmentation by bare and dressed light ions with MeV energies: Fragment-ion-energy and time-of-flight distributions

    NASA Astrophysics Data System (ADS)

    Wolff, W.; Luna, H.; Schuch, R.; Cariatore, N. D.; Otranto, S.; Turco, F.; Fregenal, D.; Bernardi, G.; Suárez, S.

    2016-08-01

    The energy and time-of-flight distributions of water ionic fragments produced by impact of fast atoms and bare and dressed ions; namely, H+, Li0 -3 +, C1 +, and C2 + are reported in this work. Fragment species as a function of emission energy and time-of-flight were recorded by using an electrostatic spectrometer and a time-of-flight mass spectrometer, respectively. An improved Coulomb explosion model coupled to a classical trajectory Monte Carlo (CTMC) simulation gave the energy centroids of the fragments for the dissociation channels resulting from the removal of two to five electrons from the water molecule. For the energy distribution ranging up to 50 eV, both the experiment and model reveal an isotropic production of multiple charged oxygen ions, as well as hydrogen ions. From the ion energy distribution, relative yields of the dissociation resulting from multiple ionization were obtained as a function of the charge state, as well as for several projectile energies. Multiple-ionization yields with charge state up to 4+, were extracted from the measurements of the time-of-flight spectra, focused on the production of single and multiple charged oxygen ions. The measurements were compared to ion-water collision experiments investigated at the keV energy range available in the literature, revealing differences and similarities in the fragment-ion energy distribution.

  14. Extending ion-track lithography to the low-energy ion regime

    SciTech Connect

    Musket, R G

    2005-10-14

    Ion tracking and ion-track lithography have been performed almost exclusively using ions with energies near or above the maximum in electronic stopping, which occurs at {approx}1 MeV/amu. In this paper, ion-track lithography using ions with energies well below this maximum is discussed. The results of etching ion tracks created in polycarbonate films by ions with energies just above the anticipated threshold for creating etchable latent tracks with cylindrical geometry have been examined. Low-energy neon and argon ions with 18-60 keV/amu and fluences of {approx}10{sup 8}/cm{sup 2} were used to examine the limits for producing useful, etchable tracks in polycarbonate films. By concentrating on the early stages of etching (i.e., {approx}20 nm < SEM hole diameter < {approx}100 nm), the energy deposition calculated for the incident ion was correlated with the creation of etchable tracks. The experimental results are discussed with regard to the energy losses of the ions in the polycarbonate films and to the formation of continuous latent tracks through the entire thickness of the films. The probability distributions for large-angle scattering events were calculated to assess their importance as a function of ion energy. All these results have significant implications with respect to the threshold for formation of etchable tracks and to the use of low-energy ions for lithographic applications of ion tracking.

  15. Extending ion-track lithography to the low-energy ion regime

    SciTech Connect

    Musket, R.G.

    2006-06-01

    Ion tracking and ion-track lithography have been performed almost exclusively using ions with energies near or above the maximum in electronic stopping, which occurs at {approx}1 MeV/amu. In this paper, ion-track lithography using ions with energies well below this maximum is discussed. The results of etching ion tracks created in polycarbonate films by ions with energies just above the anticipated threshold for creating etchable latent tracks with cylindrical geometry have been examined. Low-energy neon and argon ions with 18-60 keV/amu and fluences of {approx}10{sup 8} cm{sup -2} were used to examine the limits for producing useful, etchable tracks in polycarbonate films. By concentrating on the early stages of etching (i.e., {approx}20 nmenergy deposition calculated for the incident ion was correlated with the creation of etchable tracks. The experimental results are discussed with regard to the energy losses of the ions in the polycarbonate films and to the formation of continuous latent tracks through the entire thickness of the films. The probability distributions for large-angle scattering events were calculated to assess their importance as a function of ion energy. All these results have significant implications with respect to the threshold for formation of etchable tracks and to the use of low-energy ions for lithographic applications of ion tracking.

  16. Focused ion beam assisted three-dimensional rock imaging at submicron scale

    SciTech Connect

    Tomutsa, Liviu; Radmilovic, Velimir

    2003-05-09

    Computation of effective flow properties of fluids in porous media based on three dimensional (3D) pore structure information has become more successful in the last few years, due to both improvements in the input data and the network models. Computed X-ray microtomography has been successful in 3D pore imaging at micron scale, which is adequate for many sandstones. For other rocks of economic interest, such as chalk and diatomite, submicron resolution is needed in order to resolve the 3D-pore structure. To achieve submicron resolution, a new method of sample serial sectioning and imaging using Focused Ion Beam (FIB) technology has been developed and 3D pore images of the pore system for diatomite and chalk have been obtained. FIB was used in the milling of layers as wide as 50 micrometers and as thin as 100 nanometers by sputtering of atoms from the sample surface. The focused ion beam, consisting of gallium ions (Ga+) accelerated by potentials of up to 30 kV and currents up to 20,000 pA, yields very clean, flat surfaces in which the pore-grain boundaries appear in high contrast. No distortion of the pore boundaries due to the ion milling is apparent. After each milling step, as a new surface is exposed, an image of the surface is generated. Using secondary electrons or ions, resolutions as high as 10 nm can be obtained. Afterwards, the series of 2D images can be stacked in the computer and, using appropriate interpolation and surface rendering algorithms, the 3D pore structure is reconstructed.

  17. Propagation of focused and multibeam laser energy in biological tissue.

    PubMed

    Fowler, A J; Menguc, M P

    2000-10-01

    The results of a Monte Carlo simulation of laser beam propagation in turbid media are presented. The study was performed to determine whether using a focused beam or multiple beams instead of a single collimated beam could improve subsurface laser energy delivery in biological tissue. A parametric study was carried out to determine both the laser fluence at a target depth and the ratio of fluence at the target over surface fluence as a function of tissue properties and the mode of energy delivery. It was found that the reduced scattering coefficient was the primary determinant as to whether multibeam or focused beam delivery could be effective. A focused beam was found to be extremely effective in increasing fluence at the target if the dimensionless reduced scattering coefficient was less than 2. The delivered fluence, however, was found to be extremely sensitive to tissue properties. A five-beam laser system was found to be less effective at increasing fluence at the target than a focused beam; but the fluence delivered by a five-beam system was far less sensitive to tissue properties, thereby making accurate dosimetry more feasible.

  18. Low Energy Ion-Molecule Reactions

    SciTech Connect

    James M. Farrar

    2004-05-01

    This objective of this project is to study the dynamics of the interactions of low energy ions important in combustion with small molecules in the gas phase and with liquid hydrocarbon surfaces. The first of these topics is a long-standing project in our laboratory devoted to probing the key features of potential energy surfaces that control chemical reactivity. The project provides detailed information on the utilization of specific forms of incident energy, the role of preferred reagent geometries, and the disposal of total reaction energy into product degrees of freedom. We employ crossed molecular beam methods under single collision conditions, at collision energies from below one eV to several eV, to probe potential surfaces over a broad range of distances and interaction energies. These studies allow us to test and validate dynamical models describing chemical reactivity. Measurements of energy and angular distributions of the reaction products with vibrational state resolution provide the key data for these studies. We employ the crossed beam low energy mass spectrometry methods that we have developed over the last several years.

  19. Production of High Energy Ions Near an Ion Thruster Discharge Hollow Cathode

    NASA Technical Reports Server (NTRS)

    Katz, Ira; Mikellides, I. G.; Goebel, D. M.; Jameson, K. K.; Wirz, R.; Polk, James E.

    2006-01-01

    Several researchers have measured ions leaving ion thruster discharge chambers with energies far greater than measured discharge chamber potentials. Presented in this paper is a new mechanism for the generation of high energy ions and a comparison with measured ion spectra. The source of high energy ions has been a puzzle because they not only have energies in excess of measured steady state potentials, but as reported by Goebel et. al. [1], their flux is independent of the amplitude of time dependent plasma fluctuations. The mechanism relies on the charge exchange neutralization of xenon ions accelerated radially into the potential trough in front of the discharge cathode. Previous researchers [2] have identified the importance of charge exchange in this region as a mechanism for protecting discharge cathode surfaces from ion bombardment. This paper is the first to identify how charge exchange in this region can lead to ion energy enhancement.

  20. Soft X-Ray Magnetic Imaging of Focused Ion Beam Lithographically Patterned Fe Thin Films

    SciTech Connect

    Cook, Paul J.; Shen, Tichan H.; Grundy, PhilJ.; Im, Mi Young; Fischer, Peter; Morton, Simon A.; Kilcoyne, Arthur D.L.

    2008-11-09

    We illustrate the potential of modifying the magnetic behavior and structural properties of ferromagnetic thin films using focused ion beam 'direct-write' lithography. Patterns inspired by the split-ring resonators often used as components in meta-materials were defined upon 15 nm Fe films using a 30 keV Ga{sup +} focused ion beam at a dose of 2 x 10{sup 16} ions cm{sup -2}. Structural, chemical and magnetic changes to the Fe were studied using transmission soft X-ray microscopy at the ALS, Berkeley CA. X-ray absorption spectra showed a 23% reduction in the thickness of the film in the Ga irradiated areas, but no change to the chemical environment of Fe was evident. X-ray images of the magnetic reversal process show domain wall pinning around the implanted areas, resulting in an overall increase in the coercivity of the film. Transmission electron microscopy showed significant grain growth in the implanted regions.

  1. Focused helium-ion beam irradiation effects on electrical properties of multi-layer WSe2

    NASA Astrophysics Data System (ADS)

    Pudasaini, Pushpa Raj; Stanford, Michael; Cross, Nick; Duscher, Gerd; Mandrus, David; Rack, Philip

    Atomically thin transition metal dichalcogenides (TMDs) are currently receiving great attention due to their excellent opto-electronic properties. Tuning optical and electrical properties of mono and few layers TMDs, such as Tungsten diselenide (WSe2), by controlling the defects, is an intriguing opportunity to fabricate the next generation opto-electronic devices. Here, we report the effects of focused helium ion beam irradiation on structural, optical and electrical properties of few layer WSe2, via high resolution scanning transmission electron microscopy, Raman spectroscopy and electrical measurements. By controlling the ion irradiation dose, we selectively introduced precise defects in few layer WSe2 thereby locally tuning the electrically resistivity of the material. Hole transport in the few layer WSe2 is severely affected compared to electron transport for the same dose of helium ion beam irradiation studied. Furthermore, by selectively exposing the ion beams, we demonstrate the lateral p-n junction in few layer WSe2 flakes, which constitute an important advance towards two dimensional opto-electronic devices. Materials Science and Technology Division, ORNL, Oak Ridge, TN 37831, USA.

  2. Damage in III-V compounds during focused ion beam milling.

    PubMed

    Rubanov, S; Munroe, P R

    2005-10-01

    The damage layers generated in III-V compounds exposed to energetic gallium ions in a focused ion beam (FIB) instrument have been characterized by transmission electron microscopy (TEM). The damage on the side walls of the milled trenches is in the form of amorphous layers associated with direct amorphization from the gallium beam, rather than from redeposition of milled material. However, the damage on the bottom of the milled trenches is more complex. For InP and InAs the damage layers include the presence of crystalline phases resulting from recrystallization associated heating from the incident beam and gallium implantation. In contrast, such crystalline phases are not present in GaAs. The thicknesses of the damage layers are greater than those calculated from theoretical models of ion implantation. These differences arise because the dynamic nature of FIB milling means that the energetic ion beams pass through already damaged layers. In InP recoil phosphorus atoms also cause significant damage.

  3. Axial focusing of energy from a hypervelocity impact on earth

    SciTech Connect

    Boslough, M.B.; Chael, E.P.; Trucano, T.G.; Crawford, D.A.

    1994-12-01

    We have performed computational simulations to determine how energy from a large hypervelocity impact on the Earth`s surface would couple to its interior. Because of the first-order axial symmetry of both the impact energy source and the stress-wave velocity structure of the Earth, a disproportionate amount of energy is dissipated along the axis defined by the impact point and its antipode (point opposite the impact). For a symmetric and homogeneous Earth model, all the impact energy that is radiated as seismic waves into the Earth at a given takeoff angle (ray parameter), independent of azimuthal direction, is refocused (minus attenuation) on the axis of symmetry, regardless of the number of reflections and refractions it has experienced. Material on or near the axis of symmetry experiences more strain cycles with much greater amplitude than elsewhere, and therefore experiences more irreversible heating. The focusing is most intense in the upper mantle, within the asthenosphere, where seismic energy is most effectively converted to heat. For a sufficiently energetic impact, this mechanism might generate enough local heating to create an isostatic instability leading to uplift, possibly resulting in rifting, volcanism, or other rearrangement of the interior dynamics of the planet. These simulations demonstrate how hypervelocity impact energy can be transported to the Earth`s interior, supporting the possibility of a causal link between large impacts on Earth and major internally-driven geophysical processes.

  4. Focused ion beam induced synthesis of antimony nanowires for gas sensor applications

    NASA Astrophysics Data System (ADS)

    Schoendorfer, Christoph; Hetzel, Martin; Pongratz, Peter; Lugstein, Alois; Bertagnolli, Emmerich

    2012-11-01

    In this paper the formation of antimony (Sb) nanowires (NWs) by a focused Ga ion beam approach and their gas sensing capability is reported. The NWs with uniform diameters of only 25 nm and lengths up to several microns are synthesized at predefined positions at room temperature in an ion beam induced self-assembling process. Then individual Sb-NWs are deposited on insulating substrates and provided with gold electrodes. Subsequently sensing characteristics of individual Sb-NWs are investigated at room temperature for H2O, CO, H2, He, O2 and ethanol over a wide concentration range. The Sb-NWs exhibit selective sensing properties for ethanol and H2O with exceptional sensitivities of more than 17 000 and 60 000, respectively.

  5. Membrane Thickness Dependence of Nanopore Formation with a Focused Helium Ion Beam

    PubMed Central

    Sawafta, Furat; Carlsen, Autumn T.; Hall, Adam R.

    2014-01-01

    Solid-state nanopores are emerging as a valuable tool for the detection and characterization of individual biomolecules. Central to their success is the realization of fabrication strategies that are both rapid and flexible in their ability to achieve diverse device dimensions. In this paper, we demonstrate the membrane thickness dependence of solid-state nanopore formation with a focused helium ion beam. We vary membrane thickness in situ and show that the rate of pore expansion follows a reproducible trend under all investigated membrane conditions. We show that this trend shifts to lower ion dose for thin membranes in a manner that can be described quantitatively, allowing devices of arbitrary dimension to be realized. Finally, we demonstrate that thin, small-diameter nanopores formed with our approach can be utilized for high signal-to-noise ratio resistive pulse sensing of DNA. PMID:24806739

  6. Gas-assisted focused-ion-beam lithography of a diamond (100) surface

    NASA Astrophysics Data System (ADS)

    Datta, A.; Wu, Yuh-Renn; Wang, Y. L.

    1999-10-01

    A focused Ga-ion beam is used to conduct lithography on a diamond (100) surface with the assistance of various gases (Cl2, O2, and XeF2). The beam-induced dilation and sputtering of the surface are measured by atomic force microscope. The dilation is found to be insensitive to the presence of assisting gases at low doses, while the sputtering is enhanced by O2 and XeF2 at high doses. The topographic evolution as a function of the ion dose is well described by a proposed semiempirical equation. Combining physical sputtering and XeF2-assisted etching, the lithographic process has been used to fabricate submicron structures on diamond surfaces.

  7. Fracture Tests of Etched Components Using a Focused Ion Beam Machine

    NASA Technical Reports Server (NTRS)

    Kuhn, Jonathan, L.; Fettig, Rainer K.; Moseley, S. Harvey; Kutyrev, Alexander S.; Orloff, Jon; Powers, Edward I. (Technical Monitor)

    2000-01-01

    Many optical MEMS device designs involve large arrays of thin (0.5 to 1 micron components subjected to high stresses due to cyclic loading. These devices are fabricated from a variety of materials, and the properties strongly depend on size and processing. Our objective is to develop standard and convenient test methods that can be used to measure the properties of large numbers of witness samples, for every device we build. In this work we explore a variety of fracture test configurations for 0.5 micron thick silicon nitride membranes machined using the Reactive Ion Etching (RIE) process. Testing was completed using an FEI 620 dual focused ion beam milling machine. Static loads were applied using a probe. and dynamic loads were applied through a piezo-electric stack mounted at the base of the probe. Results from the tests are presented and compared, and application for predicting fracture probability of large arrays of devices are considered.

  8. Iodine enhanced focused-ion-beam etching of silicon for photonic applications

    SciTech Connect

    Schrauwen, Jonathan; Thourhout, Dries van; Baets, Roel

    2007-11-15

    Focused-ion-beam etching of silicon enables fast and versatile fabrication of micro- and nanophotonic devices. However, large optical losses due to crystal damage and ion implantation make the devices impractical when the optical mode is confined near the etched region. These losses are shown to be reduced by the local implantation and etching of silicon waveguides with iodine gas enhancement, followed by baking at 300 deg. C. The excess optical loss in the silicon waveguides drops from 3500 to 1700 dB/cm when iodine gas is used, and is further reduced to 200 dB/cm after baking at 300 deg. C. We present elemental and chemical surface analyses supporting that this is caused by the desorption of iodine from the silicon surface. Finally we present a model to extract the absorption coefficient from the measurements.

  9. Membrane thickness dependence of nanopore formation with a focused helium ion beam.

    PubMed

    Sawafta, Furat; Carlsen, Autumn T; Hall, Adam R

    2014-05-06

    Solid-state nanopores are emerging as a valuable tool for the detection and characterization of individual biomolecules. Central to their success is the realization of fabrication strategies that are both rapid and flexible in their ability to achieve diverse device dimensions. In this paper, we demonstrate the membrane thickness dependence of solid-state nanopore formation with a focused helium ion beam. We vary membrane thickness in situ and show that the rate of pore expansion follows a reproducible trend under all investigated membrane conditions. We show that this trend shifts to lower ion dose for thin membranes in a manner that can be described quantitatively, allowing devices of arbitrary dimension to be realized. Finally, we demonstrate that thin, small-diameter nanopores formed with our approach can be utilized for high signal-to-noise ratio resistive pulse sensing of DNA.

  10. Measurement of ultra-low ion energy of decelerated ion beam using a deflecting electric field

    NASA Astrophysics Data System (ADS)

    Thopan, P.; Suwannakachorn, D.; Tippawan, U.; Yu, L. D.

    2015-12-01

    In investigation on ultra-low-energy ion bombardment effect on DNA, an ion beam deceleration lens was developed for high-quality ultra-low-energy ion beam. Measurement of the ion energy after deceleration was necessary to confirm the ion beam really decelerated as theoretically predicted. In contrast to conventional methods, this work used a simple deflecting electrostatic field after the deceleration lens to bend the ion beam. The beam bending distance depended on the ion energy and was described and simulated. A system for the measurement of the ion beam energy was constructed. It consisted of a pair of parallel electrode plates to generate the deflecting electrical field, a copper rod measurement piece to detect ion beam current, a vernier caliper to mark the beam position, a stepping motor to translate the measurement rod, and a webcam-camera to read the beam bending distance. The entire system was installed after the ion-beam deceleration lens inside the large chamber of the bioengineering vertical ion beam line. Moving the measurement rod across the decelerated ion beam enabled to obtain beam profiles, from which the beam bending distance could be known and the ion beam energy could be calculated. The measurement results were in good agreement with theoretical and simulated results.

  11. A Core-Particle Model for Periodically Focused Ion Beams with Intense Space-Charge

    SciTech Connect

    Lund, S M; Barnard, J J; Bukh, B; Chawla, S R; Chilton, S H

    2006-08-02

    A core-particle model is derived to analyze transverse orbits of test particles evolving in the presence of a core ion beam described by the KV distribution. The core beam has uniform density within an elliptical cross-section and can be applied to model both quadrupole and solenoidal focused beams in periodic or aperiodic lattices. Efficient analytical descriptions of electrostatic space-charge fields external to the beam core are derived to simplify model equations. Image charge effects are analyzed for an elliptical beam centered in a round, conducting pipe to estimate model corrections resulting from image charge nonlinearities. Transformations are employed to remove coherent utter motion associated with oscillations of the ion beam core due to rapidly varying, linear applied focusing forces. Diagnostics for particle trajectories, Poincare phase-space projections, and single-particle emittances based on these transformations better illustrate the effects of nonlinear forces acting on particles evolving outside the core. A numerical code has been written based on this model. Example applications illustrate model characteristics. The core-particle model described has recently been applied to identify physical processes leading to space-charge transport limits for an rms matched beam in a periodic quadrupole focusing channel [Lund and Chawla, Nuc. Instr. and Meth. A 561, 203 (2006)]. Further characteristics of these processes are presented here.

  12. New advancements in focused ion beam repair of alternating phase-shift masks

    NASA Astrophysics Data System (ADS)

    Lessing, Joshua; Robinson, Tod; Brannen, Rey A.; Morrison, Troy B.; Holtermann, Theresa

    2003-08-01

    As advanced photolithography extends the ability to print feature sizes below the 100 nm technology node, various reticle enhancement techniques (RET) are being employed to improve resolution. An example of RET is the alternating phase shift mask (APSM), which currently challenges the ability of conventional repair techniques to repair even the most basic reticle defect. The phase shifting quartz bump is one defect type critical to the performance of APSM technology masks. These defects on the APSM reticle are caused by imperfections in the resist image during processing, resulting in a localized under or over etch of the quartz substrate. The integrated application of gas assisted etch (GAE), focused ion beam (FIB) reticle repair, and atomic force microscopy (AFM), provide a comprehensive solution for advanced reticle defect repair and characterization. Ion beam repair offers superior accuracy and precision for removal without significant damage to the underlying or adjacent quartz. The AFM technique provides quantitative measurement of 3D structures, including those associated with alternating phase shifters etched into quartz as well as embedded shifters. In the work presented in this paper, quartz bum defects were pre-scanned on an AFM tool and proprietary software algorithms were used to generate defect image and height map files for transfer to the FIB reticle repair tool via a network connection. The FIB tool then used these files to control selectively the ion dose during the corresponding quartz defect repair. A 193 nm APSM phase shift photomask with programmed defects in 400 nm line and space pattern was repaired using an FEI Stylus NanoProfilometer (SNP) and a FEI Accura 850 focus ion beam (FIB) tool. Using the APSM FIB repair method, the transmittance evaluated from 193 nm AIMS at the repair area was more than 90% without post-processing.

  13. Microscopic diamond solid-immersion-lenses fabricated around single defect centers by focused ion beam milling

    SciTech Connect

    Jamali, Mohammad; Rezai, Mohammad; Fedder, Helmut; Gerhardt, Ilja; Wrachtrup, Jörg; Frenner, Karsten

    2014-12-15

    Recent efforts to define microscopic solid-immersion-lenses (SIL) by focused ion beam milling into diamond substrates that are registered to a preselected single photon emitter are summarized. We show how we determine the position of a single emitter with at least 100 nm lateral and 500 nm axial accuracy, and how the milling procedure is optimized. The characteristics of a single emitter, a Nitrogen Vacancy (NV) center in diamond, are measured before and after producing the SIL and compared with each other. A count rate of 1.0 × 10{sup 6} counts/s is achieved with a [111] oriented NV center.

  14. Effects of coating material on the fabrication accuracy of focused ion beam machining of insulators

    NASA Astrophysics Data System (ADS)

    Joe, Hang-Eun; Park, Jae-Hyeong; Kim, Seong Hyeon; Kim, Gyuho; Jun, Martin B. G.; Min, Byung-Kwon

    2015-09-01

    Focused ion beam (FIB) machining of insulators is a crucial process in the rapid prototyping of nanodevices for optical applications. A conductive material is generally coated on the insulator prior to FIB machining to achieve high fabrication accuracy. In this paper, we report on the effects on machining accuracy of four coating materials: Pt, Ni, Ag, and Co. The dimensional accuracy at channel sidewalls was improved by selecting a coating material that induces charge-carrier generation in a small range. The geometric and electrical characteristics of the FIB-machined surfaces were evaluated to elucidate the association between the fabrication accuracy and the range of charge-carrier distribution.

  15. Use of the focusing multi-slit ion optical system at RUssian Diagnostic Injector (RUDI)

    SciTech Connect

    Listopad, A.; Davydenko, V.; Ivanov, A.; Mishagin, V.; Savkin, V.; Shulzhenko, G.; Coenen, J.; Schweer, B.; Uhlemann, R.

    2012-02-15

    The upgrade of the diagnostic neutral beam injector RUDI in 2010 was performed to increase the beam density at the focal plane in accordance with the requirements of charge-exchange recombination spectroscopy diagnostics. A new focusing ion-optical system (IOS) with slit beamlets and an enlarged aperture was optimized for 50% higher nominal beam current and reduced angular divergence with respect to the previous multi-aperture IOS version. The upgraded injector provides the beam current up to 3 A, the measured beam divergence in the direction along the slits is 0.35 deg. Additionally, the plasma generator was modified to extend the beam pulse to 8 s.

  16. Microwave guiding and intense plasma generation at subcutoff dimensions for focused ion beams

    SciTech Connect

    Mathew, Jose V.; Dey, Indranuj; Bhattacharjee, Sudeep

    2007-07-23

    The mechanism of microwave guiding and plasma generation is investigated in a circular waveguide with a subcutoff dimension using pulsed microwaves of 3 GHz. During the initial phase, gaseous breakdown is induced by the exponentially decaying wave. Upon breakdown, the refractive index of the plasma medium varies radially, with the plasma density reaching close to cutoff values in the central region. At lower pressures, the waves can propagate through the peripheral plasma with a reduced wavelength, due to the collisionally broadened upper hybrid resonance region. The intense narrow cross sectional plasma bears promise for multielemental focused ion beams.

  17. Fabrication and characterization of highly reproducible, high resistance nanogaps made by focused ion beam milling

    NASA Astrophysics Data System (ADS)

    Blom, T.; Welch, K.; Strømme, M.; Coronel, E.; Leifer, K.

    2007-07-01

    Nanoelectrodes were fabricated combining photolithography, electron beam lithography and focused ion beam milling allowing for large scale integration and nanoengineering of the electrode properties. The structure determination by transmission and scanning electron microscopy showed a highly reproducible gap width. The atomic scale electrode structure was characterized using scanning and transmission electron microscopy. The nanogap resistances were found to be the highest hitherto reported for nanogaps, namely in the 300-1300 TΩ range. Gold nanoparticles were trapped by ac dielectrophoresis, and the electrodes were shown to be stable enough to endure empty gap voltages as high as 5 V as well as currents high enough to induce fusing of trapped nanoparticles.

  18. Focused Ion Beam Recovery and Analysis of Interplanetary Dust Particles (IDPs) and Stardust Analogues

    NASA Technical Reports Server (NTRS)

    Graham, G. A.; Bradley, J. P.; Bernas, M.; Stroud, R. M.; Dai, Z. R.; Floss, C.; Stadermann, F. J.; Snead, C. J.; Westphal, A. J.

    2004-01-01

    Meteoritics research is a major beneficiary of recent developments in analytical instrumentation [1,2]. Integrated studies in which multiple analytical techniques are applied to the same specimen are providing new insight about the nature of IDPs [1]. Such studies are dependent on the ability to prepare specimens that can be analyzed in multiple instruments. Focused ion beam (FIB) microscopy has revolutionized specimen preparation in materials science [3]. Although FIB has successfully been used for a few IDP and meteorite studies [1,4-6], it has yet to be widely utilized in meteoritics. We are using FIB for integrated TEM/NanoSIMS/synchrotron infrared (IR) studies [1].

  19. Replication of the nano-scale mold fabricated with focused ion beam

    NASA Astrophysics Data System (ADS)

    Gao, J. X.; Chan-Park, M. B.; Xie, D. Z.; Ngoi, Bryan K. A.

    2004-12-01

    Silicon mold fabricated with Focused Ion Beam lithography (FIB) was used to make silicone elastomer molds. The silicon mold is composed of lattice of holes which the diameter and depth are about 200 nm and 60 nm, respectively. The silicone elastomer material was then used to replicate slavery mold. Our study show the replication process with the elastomer mold had been performed successfully and the diameter of humps on the elastomer mold is near to that of holes on the master mold. But the height of humps in the elastomer mold is only 42 nm and it is different from the depth of holes in the master mold.

  20. Interaction of the high energy deuterons with the graphite target in the plasma focus devices based on Lee model

    SciTech Connect

    Akel, M. Alsheikh Salo, S.; Ismael, Sh.; Saw, S. H.; Lee, S.

    2014-07-15

    Numerical experiments are systematically carried out using the Lee model code extended to compute the ion beams on various plasma focus devices operated with Deuterium gas. The deuteron beam properties of the plasma focus are studied for low and high energy plasma focus device. The energy spectral distribution for deuteron ions ejected from the pinch plasma is calculated and the ion numbers with energy around 1 MeV is then determined. The deuteron–graphite target interaction is studied for different conditions. The yield of the reaction {sup 12}C(d,n){sup 13}N and the induced radioactivity for one and multi shots plasma focus devices in the graphite solid target is investigated. Our results present the optimized high energy repetitive plasma focus devices as an alternative to accelerators for the production of {sup 13}N short lived radioisotopes. However, technical challenges await solutions on two fronts: (a) operation of plasma focus machines at high rep rates for a sufficient period of time (b) design of durable targets that can take the thermal load.

  1. PERFORMANCE LIMITATIONS IN HIGH-ENERGY ION COLLIDERS

    SciTech Connect

    FISCHER, W.

    2005-05-16

    High-energy ion colliders (hadron colliders operating with ions other than protons) are premier research tools for nuclear physics. The collision energy and high luminosity are important design and operations considerations. The experiments also expect flexibility with frequent changes in the collision energy, detector fields, and ion species, including asymmetric collisions. For the creation, acceleration, and storage of bright intense ion beams limits are set by space charge, charge exchange, and intrabeam scattering effects. The latter leads to luminosity lifetimes of only a few hours for intense heavy ions beams. Currently, the Relativistic Heavy Ion Collider (RHIC) at BNL is the only operating high-energy ion collider. Later this decade the Large Hadron Collider (LHC), under construction at CERN, will also run with heavy ions.

  2. Can particle beam therapy be improved using helium ions? - a planning study focusing on pediatric patients.

    PubMed

    Knäusl, Barbara; Fuchs, Hermann; Dieckmann, Karin; Georg, Dietmar

    2016-06-01

    Aim To explore the potential of scanned helium ion beam therapy ((4)He) compared to proton therapy in a comparative planning study focusing on pediatric patients. This was motivated by the superior biological and physical characteristics of (4)He. Material and methods For eleven neuroblastoma (NB), nine Hodgkin lymphoma (HL), five Wilms tumor (WT), five ependymoma (EP) and four Ewing sarcoma (EW) patients, treatment plans were created for protons and (4)He. Dose prescription to the planning target volume (PTV) was 21 Gy [relative biological effectiveness (RBE)] (NB), 19.8 Gy (RBE) (HL), 25.2 Gy (RBE) for the WT boost volume and 54 Gy (RBE) for EP and EW patients. A pencil beam algorithm for protons (constant RBE = 1.1) and (4)He was implemented in the treatment planning system Hyperion. For (4)He the relative biological effectiveness (RBE) was calculated with a 'zonal' model based on different linear energy transfer regions. Results Target constraints were fulfilled for all indications. For NB patients differences for kidneys and liver were observed for all dose-volume areas, except the high-dose volume. The body volume receiving up to 12.6 Gy (RBE) was reduced by up to 10% with (4)He. For WT patients the mean and high-dose volume for the liver was improved when using (4)He. For EP normal tissue dose was reduced using (4)He with 12.7% of the voxels receiving higher doses using protons. For HL and EW sarcoma patients the combination of large PTV volumes with the position of the organs at risk (OARs) obliterated the differences between the two particle species, while patients with the heart close to the PTV could benefit from (4)He. Conclusion Treatment plan quality improved with (4)He compared to proton plans, but advantages in OAR sparing were depending on indication and tumor geometries. These first results of scanned (4)He therapy motivate comprehensive research on (4)He, including acquisition of experimental data to improve modeling of (4)He. PMID

  3. Free energy of ion hydration: Interface susceptibility and scaling with the ion size

    NASA Astrophysics Data System (ADS)

    Dinpajooh, Mohammadhasan; Matyushov, Dmitry V.

    2015-07-01

    Free energy of solvation of a spherical ion in a force-field water is studied by numerical simulations. The focus is on the linear solvation susceptibility connecting the linear response solvation free energy to the squared ion charge. Spherical hard-sphere solutes, hard-sphere ions, and Kihara solutes (Lennard-Jones modified hard-sphere core) are studied here. The scaling of the solvation susceptibility with the solute size significantly deviates from the Born equation. Using empirical offset corrections of the solute size (or the position of the first peak of the solute-solvent distribution function) do not improve the agreement with simulations. We advance a new perspective on the problem by deriving an exact relation for the radial susceptibility function of the interface. This function yields an effective cavity radius in the Born equation calculated from the solute-solvent radial distribution function. We find that the perspective of the local response, assuming significant alteration of the solvent structure by the solute, is preferable compared to the homogeneous approximation assuming intact solvent structure around the solute. The model finds a simple explanation of the asymmetry of hydration between anions and cations in denser water shells around anions and smaller cavity radii arising from the solute-solvent density profiles.

  4. Final Focus Shielding Designs for Modern Heavy-Ion Fusion Power Plant Designs

    SciTech Connect

    Latkowski, J F; Meier, W R

    2000-07-05

    Recent work in heavy-ion fusion accelerators and final focusing systems shows a trend towards less current per beam, and thus, a greater number of beams. Final focusing magnets are susceptible to nuclear heating, radiation damage, and neutron activation. The trend towards more beams, however, means that there can be less shielding for each magnet, Excessive levels of nuclear heating may lead to magnet quench or an intolerable recirculating power for magnet cooling. High levels of radiation damage may result in short magnet lifetimes and low reliability. Finally, neutron activation of the magnet components may lead to difficulties in maintenance, recycling, and waste disposal. The present work expands upon previous, three-dimensional magnet shielding calculations for a modified version of the HYLIFE-I1 IFE power plant design. We present key magnet results as a function of the number of beams.

  5. Optimization of a 3x3 focusing array for heavy ion drivers

    SciTech Connect

    Martovetsky, N N; Meinke, R B

    2005-08-08

    A heavy ion driver for inertial fusion will accelerate an array of beams through common induction cores and then direct the beams onto the DT target. An array of quadrupole focusing magnets is used to prevent beam expansion from space charge forces. In the array, the magnet fields from the coils embracing the beams are coupled, which reduces the cost of superconductor and increases the focusing power. The challenges in designing such an array are meeting the strict requirements for the quadrupole field inside the beam pipes and preventing stray fields outside. We report our optimization effort on designing such an array and show that 3 x 3 or larger arrays are feasible and practical to build with flat racetrack coils.

  6. High-energy accelerator for beams of heavy ions

    DOEpatents

    Martin, Ronald L.; Arnold, Richard C.

    1978-01-01

    An apparatus for accelerating heavy ions to high energies and directing the accelerated ions at a target comprises a source of singly ionized heavy ions of an element or compound of greater than 100 atomic mass units, means for accelerating the heavy ions, a storage ring for accumulating the accelerated heavy ions and switching means for switching the heavy ions from the storage ring to strike a target substantially simultaneously from a plurality of directions. In a particular embodiment the heavy ion that is accelerated is singly ionized hydrogen iodide. After acceleration, if the beam is of molecular ions, the ions are dissociated to leave an accelerated singly ionized atomic ion in a beam. Extraction of the beam may be accomplished by stripping all the electrons from the atomic ion to switch the beam from the storage ring by bending it in magnetic field of the storage ring.

  7. Spectromicroscopy and coherent diffraction imaging: focus on energy materials applications.

    PubMed

    Hitchcock, Adam P; Toney, Michael F

    2014-09-01

    Current and future capabilities of X-ray spectromicroscopy are discussed based on coherence-limited imaging methods which will benefit from the dramatic increase in brightness expected from a diffraction-limited storage ring (DLSR). The methods discussed include advanced coherent diffraction techniques and nanoprobe-based real-space imaging using Fresnel zone plates or other diffractive optics whose performance is affected by the degree of coherence. The capabilities of current systems, improvements which can be expected, and some of the important scientific themes which will be impacted are described, with focus on energy materials applications. Potential performance improvements of these techniques based on anticipated DLSR performance are estimated. Several examples of energy sciences research problems which are out of reach of current instrumentation, but which might be solved with the enhanced DLSR performance, are discussed.

  8. Analysis of the theory of high energy ion transport

    NASA Technical Reports Server (NTRS)

    Wilson, J. W.

    1977-01-01

    Procedures for the approximation of the transport of high-energy ions are discussed on the basis of available data on ion nuclear reactions. A straightahead approximation appears appropriate for space applications. The assumption that the secondary-ion-fragment velocity is equal to that of the fragmenting nucleus is inferior to straightahead theory but is of sufficient accuracy if the primary ions display a broad energy spectrum. An iterative scheme for the solution of the inhomogenous integral transport equations holds promise for practical calculation. A model calculation shows that multiple charged ion fragments penetrate to greater depths in comparison with the free path of a primary heavy ion.

  9. Electron energy recovery system for negative ion sources

    DOEpatents

    Dagenhart, W.K.; Stirling, W.L.

    1979-10-25

    An electron energy recovery system for negative ion sources is provided. The system, employing crossed electric and magnetic fields, separates the electrons from the ions as they are extracted from the ion source plasma generator and before the ions are accelerated to their full energy. With the electric and magnetic fields oriented 90/sup 0/ to each other, the electrons remain at approximately the electrical potential at which they were generated. The electromagnetic forces cause the ions to be accelerated to the full accelerating supply voltage energy while being deflected through an angle of less than 90/sup 0/. The electrons precess out of the accelerating field region into an electron recovery region where they are collected at a small fraction of the full accelerating supply energy. It is possible, by this method, to collect > 90% of the electrons extracted along with the negative ions from a negative ion source beam at < 4% of full energy.

  10. Arsenic contamination of groundwater in Nawabganj, Bangladesh, focusing on the relationship with other metals and ions.

    PubMed

    Ohno, K; Furukawa, A; Hayashi, K; Kamei, T; Magara, Y

    2005-01-01

    Serious arsenic contamination of groundwater in Bangladesh has been frequently reported and is of great concern. In this research, repeated water sampling from the same 10 tubewells in Nawabganj municipality, Bangladesh, was conducted and analysed, focusing on the seasonal variation of water quality and the relationship among arsenic and other metals and ions. For the seasonal variation of water quality, arsenic and iron concentrations were higher in the rainy season in general although the tendency was not consistent and it depended on the tubewell and the time. Correlation between arsenic and iron could not be observed in this study (r = -0.01) when using all cases. This was because no correlation was observed in the higher arsenic concentration range. Arsenic removal by co-precipitation with coexisting iron is known as one of the locally applicable techniques in Bangladesh, but the result from this study suggests that some additional treatments such as the extra injection of iron should be performed in some cases, especially where the arsenic concentration is high. The correlation between arsenic and other substances was also analysed. As a result, manganese (r = 0.37), molybdenum (r = 0.33) and sulfate ion (r = -0.33) significantly correlated with arsenic (p < 0.05). The negative correlation between arsenic and sulfate ion implies the dissolution of arsenic into groundwater under reductive conditions although there are some exceptional cases.

  11. Selective etching of focused gallium ion beam implanted regions from silicon as a nanofabrication method

    NASA Astrophysics Data System (ADS)

    Han, Zhongmei; Vehkamäki, Marko; Mattinen, Miika; Salmi, Emma; Mizohata, Kenichiro; Leskelä, Markku; Ritala, Mikko

    2015-07-01

    A focused ion beam (FIB) is otherwise an efficient tool for nanofabrication of silicon structures but it suffers from the poor thermal stability of the milled surfaces caused by segregation of implanted gallium leading to severe surface roughening upon already slight annealing. In this paper we show that selective etching with KOH:H2O2 solutions removes the surface layer with high gallium concentration while blocking etching of the surrounding silicon and silicon below the implanted region. This remedies many of the issues associated with gallium FIB nanofabrication of silicon. After the gallium removal sub-nm surface roughness is retained even during annealing. As the etching step is self-limited to a depth of 25-30 nm for 30 keV ions, it is well suited for defining nanoscale features. In what is essentially a reversal of gallium resistless lithography, local implanted areas can be prepared and then subsequently etched away. Nanopore arrays and sub-100 nm trenches can be prepared this way. When protective oxide masks such as Al2O3 grown with atomic layer deposition are used together with FIB milling and KOH:H2O2 etching, ion-induced amorphization can be confined to sidewalls of milled trenches.

  12. Mechanisms of focused ion beam (FIB) material removal and rearrangement at high beam flux

    NASA Astrophysics Data System (ADS)

    Das, Kallol

    Focused ion beam (FIB) is widely used as a material removal tool for applications ranging from electron microscope sample preparation to nanopore processing for DNA sequencing. Despite the wide spread use of FIB, the basic material removal mechanisms are not well understood and may depend upon FIB operations. We present the first complete atomistic simulation of high-flux FIB using large-scale parallel molecular dynamics (MD) simulations of nanopore fabrication in freestanding thin films. We focus on the root mechanisms as described by large-scale MD simulations of FIB and describe the role of explosive boiling and Marangoni effect as a material removal and rearrangement mechanism and the mixing and transport that occur at the atomic scale. Nanopore fabrication using FIB is typically understood to occur via sputter erosion. While this theory may describe low-flux systems, where individual ion impacts are sufficiently separated in time to consider them as independent events, it cannot explain the thermal events observed during high flux simulations. A dimensionless number is introduced, which is constructed from the key variables including material properties and FIB parameters. This number suggests strong thermal effects when it is greater than unity. Similarly, our detailed MD simulations suggest that for ion beam fluxes above a threshold level, the dominant mechanism of material removal changes to a significantly accelerated, thermally dominated process, consistent with our dimensional analysis. During this time, the target is heated faster than it cools, leading to melting, with local temperatures approaching the critical temperature. This leads to an explosive boiling of the target material with spontaneous bubble formation. Atomic mass is rapidly rearranged via bubble growth and coalescence and material removal is orders of magnitude faster than would occur by simple sputtering. For a range of ion intensities in a realistic configuration, a recirculating melt

  13. Magnetized retarding field energy analyzer measuring the particle flux and ion energy distribution of both positive and negative ions

    SciTech Connect

    Rafalskyi, Dmytro; Aanesland, Ane; Dudin, Stanislav

    2015-05-15

    This paper presents the development of a magnetized retarding field energy analyzer (MRFEA) used for positive and negative ion analysis. The two-stage analyzer combines a magnetic electron barrier and an electrostatic ion energy barrier allowing both positive and negative ions to be analyzed without the influence of electrons (co-extracted or created downstream). An optimal design of the MRFEA for ion-ion beams has been achieved by a comparative study of three different MRFEA configurations, and from this, scaling laws of an optimal magnetic field strength and topology have been deduced. The optimal design consists of a uniform magnetic field barrier created in a rectangular channel and an electrostatic barrier consisting of a single grid and a collector placed behind the magnetic field. The magnetic barrier alone provides an electron suppression ratio inside the analyzer of up to 6000, while keeping the ion energy resolution below 5 eV. The effective ion transparency combining the magnetic and electrostatic sections of the MRFEA is measured as a function of the ion energy. It is found that the ion transparency of the magnetic barrier increases almost linearly with increasing ion energy in the low-energy range (below 200 eV) and saturates at high ion energies. The ion transparency of the electrostatic section is almost constant and close to the optical transparency of the entrance grid. We show here that the MRFEA can provide both accurate ion flux and ion energy distribution measurements in various experimental setups with ion beams or plasmas run at low pressure and with ion energies above 10 eV.

  14. Magnetized retarding field energy analyzer measuring the particle flux and ion energy distribution of both positive and negative ions.

    PubMed

    Rafalskyi, Dmytro; Dudin, Stanislav; Aanesland, Ane

    2015-05-01

    This paper presents the development of a magnetized retarding field energy analyzer (MRFEA) used for positive and negative ion analysis. The two-stage analyzer combines a magnetic electron barrier and an electrostatic ion energy barrier allowing both positive and negative ions to be analyzed without the influence of electrons (co-extracted or created downstream). An optimal design of the MRFEA for ion-ion beams has been achieved by a comparative study of three different MRFEA configurations, and from this, scaling laws of an optimal magnetic field strength and topology have been deduced. The optimal design consists of a uniform magnetic field barrier created in a rectangular channel and an electrostatic barrier consisting of a single grid and a collector placed behind the magnetic field. The magnetic barrier alone provides an electron suppression ratio inside the analyzer of up to 6000, while keeping the ion energy resolution below 5 eV. The effective ion transparency combining the magnetic and electrostatic sections of the MRFEA is measured as a function of the ion energy. It is found that the ion transparency of the magnetic barrier increases almost linearly with increasing ion energy in the low-energy range (below 200 eV) and saturates at high ion energies. The ion transparency of the electrostatic section is almost constant and close to the optical transparency of the entrance grid. We show here that the MRFEA can provide both accurate ion flux and ion energy distribution measurements in various experimental setups with ion beams or plasmas run at low pressure and with ion energies above 10 eV. PMID:26026517

  15. Rapid prototyping of coupled photonic cavities by focused ion beam/photolithography hybrid technique

    NASA Astrophysics Data System (ADS)

    Viegas, Jaime; Xing, Peng

    2014-03-01

    Hybrid photolithography and focused ion beam (FIB) patterning of coupled photonic cavities is reported. This technique is used for rapid prototyping of nanophotonic devices, where previously mass-produced devices by conventional lithography steps, such as photolithography, projection lithography or nano/micro-imprinting can be customized by a versatile approach on a focused ion beam microscope. This requires accurate positioning of the FIB pattern relative to the pre-patterned devices and minimal drift during the writing phase. Various fabrication parameters that mimic process variability can be studied and the obtained experimental results compared with numerical simulations of the fabricated devices. This allows the calibration of the simulation models for more accurate design to manufacturing predictability. As a proof of concept, the experimental optimization of the localized modes in a photonic molecule formed by placing two one-dimensional photonic crystal cavities on a nanowire coupler is reported. The effects of different photonic crystal geometry, material removal depth and rate, sidewall profile and roughness, patterning drift on the performance of the photonic molecule resonator are investigated. These fabricated photonic molecule devices can be used as refractive index sensors with measured sensitivities on the order of 400 nm/RIU with a sensing volume as low as 18 femtoliters. The dimensions of the fabricated devices and the understanding of their optical behavior on environmental influence open the door for near-field optical spectroscopy of single bacterial specimens.

  16. Focused Electron and Ion Beam Induced Deposition on Flexible and Transparent Polycarbonate Substrates.

    PubMed

    Peinado, Patricia; Sangiao, Soraya; De Teresa, José M

    2015-06-23

    The successful application of focused electron (and ion) beam induced deposition techniques for the growth of nanowires on flexible and transparent polycarbonate films is reported here. After minimization of charging effects in the substrate, sub-100 nm-wide Pt, W, and Co nanowires have been grown and their electrical conduction is similar compared to the use of standard Si-based substrates. Experiments where the substrate is bent in a controlled way indicate that the electrical conduction is stable up to high bending angles, >50°, for low-resistivity Pt nanowires grown by the ion beam. On the other hand, the resistance of Pt nanowires grown by the electron beam changes significantly and reversibly with the bending angle. Aided by the substrate transparency, a diffraction grating in transmission mode has been built based on the growth of an array of Pt nanowires that shows sharp diffraction spots. The set of results supports the large potential of focused beam deposition as a high-resolution nanolithography technique on transparent and flexible substrates. The most promising applications are expected in flexible nano-optics and nanoplasmonics, flexible electronics, and nanosensing.

  17. How constant momentum acceleration decouples energy and space focusing in distance-of-flight and time-of-flight mass spectrometries.

    PubMed

    Dennis, Elise A; Gundlach-Graham, Alexander W; Enke, Christie G; Ray, Steven J; Carado, Anthony J; Barinaga, Charles J; Koppenaal, David W; Hieftje, Gary M

    2013-05-01

    Resolution in time-of-flight mass spectrometry (TOFMS) is ordinarily limited by the initial energy and space distributions within an instrument's acceleration region and by the length of the field-free flight zone. With gaseous ion sources, these distributions lead to systematic flight-time errors that cannot be simultaneously corrected with conventional static-field ion-focusing devices (i.e., an ion mirror). It is known that initial energy and space distributions produce non-linearly correlated errors in both ion velocity and exit time from the acceleration region. Here we reinvestigate an old acceleration technique, constant-momentum acceleration (CMA), to decouple the effects of initial energy and space distributions. In CMA, only initial ion energies (and not their positions) affect the velocity ions gain. Therefore, with CMA, the spatial distribution within the acceleration region can be manipulated without creating ion-velocity error. The velocity differences caused by a spread in initial ion energy can be corrected with an ion mirror. We discuss here the use of CMA and independent focusing of energy and space distributions for both distance-of-flight mass spectrometry (DOFMS) and TOFMS. Performance characteristics of our CMA-DOFMS and CMA-TOFMS instrument, fitted with a glow-discharge ionization source, are described. In CMA-DOFMS, resolving powers (FWHM) of greater than 1000 are achieved for atomic ions with a flight length of 285 mm. In CMA-TOFMS, only ions over a narrow range of m/z values can be energy-focused; however, the technique offers improved resolution for these focused ions, with resolving powers of greater than 2000 for a separation distance of 350 mm.

  18. Energy Loss of High Intensity Focused Proton Beams Penetrating Metal Foils

    NASA Astrophysics Data System (ADS)

    McGuffey, C.; Qiao, B.; Kim, J.; Beg, F. N.; Wei, M. S.; Evans, M.; Fitzsimmons, P.; Stephens, R. B.; Chen, S. N.; Fuchs, J.; Nilson, P. M.; Canning, D.; Mastrosimone, D.; Foord, M. E.

    2014-10-01

    Shortpulse-laser-driven intense ion beams are appealing for applications in probing and creating high energy density plasmas. Such a beam isochorically heats and rapidly ionizes any target it enters into warm dense matter with uncertain transport and stopping properties. Here we present experimental measurements taken with the 1.25 kJ, 10 ps OMEGA EP BL shortpulse laser of the proton and carbon spectra after passing through metal foils. The laser irradiated spherically curved C targets with intensity 4×1018 W/cm2, producing proton beams with 3 MeV slope temperature and a sharp low energy cutoff at 5 MeV which has not been observed on lower energy, shorter pulse intense lasers. The beam either diverged freely or was focused to estimated 1016 p +/cm2 ps by a surrounding structure before entering the metal foils (Al or Ag and a Cu tracer layer). The proton and ion spectra were altered by the foil depending on material and whether or not the beam was focused. Transverse proton radiography probed the target with ps temporal and 10 micron spatial resolution, indicating an electrostatic field on the foil may also have affected the beam. We present complementary particle-in-cell simulations of the beam generation and transport to the foils. This work was supported by the DOE/NNSA National Laser User Facility program, Contract DE-SC0001265.

  19. Alternating-phase-focused IH-DTL for an injector of heavy-ion medical accelerators

    NASA Astrophysics Data System (ADS)

    Iwata, Y.; Yamada, S.; Murakami, T.; Fujimoto, T.; Fujisawa, T.; Ogawa, H.; Miyahara, N.; Yamamoto, K.; Hojo, S.; Sakamoto, Y.; Muramatsu, M.; Takeuchi, T.; Mitsumoto, T.; Tsutsui, H.; Watanabe, T.; Ueda, T.

    2006-12-01

    A compact Drift-Tube-Linac (DTL) using an Interdigital H-mode (IH) cavity was designed for an injector of medical accelerators. For beam focusing, the method of Alternating-Phase-Focusing (APF) was applied. The APF IH-DTL can accelerate heavy ions having a charge-to-mass ratio of q/m={1}/{3} up to 4.0 MeV/u. Having optimized an array of synchronous phases for cells, namely arranging drift tubes and gaps appropriately, both longitudinal and transverse focusing strengths were produced just with the rf acceleration field, and therefore no focusing element or cooling equipments had to be installed in the cavity. This allowed us to employ a rather high operating frequency, and hence to design a compact and cost-effective cavity. A further advantage of the APF linac can be found in its operation. Since the parameters to be adjusted are just the level and phase of the input rf, beam tuning can be made with ease. Consequently, the APF linac is suitable for an injector for medical accelerators. Tuning methods of the gap voltages and cavity frequency as well as the design of the cavity for APF IH-DTL have been developed. After constructing the cavity, measurements of the electric field and tuning of the gap voltages were performed. Finally, the rf power was fed into the cavity. In this paper, the design and results of the measurements are described.

  20. Mechanisms of material removal and mass transport in focused ion beam nanopore formation

    SciTech Connect

    Das, Kallol Johnson, Harley T.; Freund, Jonathan B.

    2015-02-28

    Despite the widespread use of focused ion beam (FIB) processing as a material removal method for applications ranging from electron microscope sample preparation to nanopore processing for DNA sequencing, the basic material removal mechanisms of FIB processing are not well understood. We present the first complete atomistic simulation of high-flux FIB using large-scale parallel molecular dynamics (MD) simulations of nanopore fabrication in freestanding thin films. We focus on the root mechanisms of material removal and rearrangement and describe the role of explosive boiling in forming nanopores. FIB nanopore fabrication is typically understood to occur via sputter erosion. This can be shown to be the case in low flux systems, where individual ion impacts are sufficiently separated in time that they may be considered as independent events. But our detailed MD simulations show that in high flux FIB processing, above a threshold level at which thermal effects become significant, the primary mechanism of material removal changes to a significantly accelerated, thermally dominated process. Under these conditions, the target is heated by the ion beam faster than heat is conducted away by the material, leading quickly to melting, and then continued heating to nearly the material critical temperature. This leads to explosive boiling of the target material with spontaneous bubble formation and coalescence. Mass is rapidly rearranged at the atomistic scale, and material removal occurs orders of magnitude faster than would occur by simple sputtering. While the phenomenology is demonstrated computationally in silicon, it can be expected to occur at lower beam fluxes in other cases where thermal conduction is suppressed due to material properties, geometry, or ambient thermal conditions.

  1. Trapping low-energy antiprotons in an ion trap

    SciTech Connect

    Fei, Xiang.

    1990-01-01

    A fraction of antiprotons from the Low Energy Antiproton Ring (LEAR) of CERN are slowed from 5.9 MeV to below 3 keV as they pass through thin foils. Transmitted particle energy distribution and low energy antiproton yield are measured by a time-of-flight technique. The difference in the range of protons and antiprotons (known as the Barkas effect) is observed. While still in flight, up to 1.3 {times} 10{sup 5} antiprotons with energies between 0 eV to 3 keV are stored in an ion trap from a single pulse of 5.9 MeV antiprotons leaving LEAR, thus a trapping efficiency exceeding of 4 {times} 10{sup {minus}4} is established. Trapped antiprotons maintain their initial energy distribution unless allowed to collide with a cloud of trapped electrons, whereupon they slow and cool below 1 meV in 10 s, and fall into a harmonic potential well suited for precision mass measurements. The slowing, trapping and cooling of antiprotons are the main focus of this thesis. The stored antiprotons are in thermal equilibrium at 4.2 K. In this ion trap, the antiproton cyclotron frequency is measured and compared with the proton (or electron) cyclotron frequency. The new measured ratio of the antiproton and proton inertial masses, with its 4 {times} 10{sup {minus}8} uncertainty, is more than three orders of magnitude more accurate than previous measurements using exotic atoms. This is a most precise test of CPT invariance with baryons. The antiproton lifetime in an ion trap was measured to be more than 103 days by trapping a cloud of antiprotons for 59 days. The indicates the number density of atoms is less than 100/cm{sup 3} which corresponds to the pressure in the vacuum chamber being less than 5 {times} 10{sup {minus}17} Torr at 4.2 K if we apply the ideal gas law.

  2. Surface modification using low energy ground state ion beams

    NASA Technical Reports Server (NTRS)

    Chutjian, Ara (Inventor); Hecht, Michael H. (Inventor); Orient, Otto J. (Inventor)

    1990-01-01

    A method of effecting modifications at the surfaces of materials using low energy ion beams of known quantum state, purity, flux, and energy is presented. The ion beam is obtained by bombarding ion-generating molecules with electrons which are also at low energy. The electrons used to bombard the ion generating molecules are separated from the ions thus obtained and the ion beam is directed at the material surface to be modified. Depending on the type of ion generating molecules used, different ions can be obtained for different types of surface modifications such as oxidation and diamond film formation. One area of application is in the manufacture of semiconductor devices from semiconductor wafers.

  3. Secondary Ions Sputtered by Low Energy Ion Bombardment of Copper and Aluminum Surfaces.

    NASA Astrophysics Data System (ADS)

    Chen, Liang-Yu.

    1995-11-01

    We have bombarded Cu and Al surfaces with rm O_2^+ ions and measured the relative yields of secondary ions in the energy range from 50 to 500 eV. We have determined both the relative yield as a function of incident ion energy and the kinetic energy distributions of the ejected ions for selected incident ion energies. In addition to looking at rm Cu^+ ions from Cu and rm Al ^+ ions from Al, we have investigated ion signals from alkali impurities in the targets. For the Cu surface, ions ejected by rm Ar^+ bombardment were examined both before and after sputter cleaning of the surface. Data on beam energy dependent secondary ion yields from the literature and this investigation have been fit by an exponential formula Acdotexp( -B/(C + E)), where A, B and C are fitting parameters. The results, with standard deviations for fitting parameters, are reported. A distinct plateau structure has been found for beam energy dependent yields of rm Na^+ and rm K^+ ions sputtered from untreated (long existing) Cu surfaces. A series of well controlled experiments indicate that this structure is caused by a surface excess of sodium and potassium at the surfaces of copper samples. The calculation of beam energy dependent energy deposition shows that the energy deposited on the top surface of a polycrystal copper target by oxygen ions rm (O_2^+) does not further increase with the increase of beam energy above 250 eV. This result very well explains the beam energy dependence of the yield of secondary alkali ions contributed from the surface excess. Combined with the experimental data, thermodynamic calculations indicate that the positive surface excess of alkali metals near Cu surfaces is due to their segregation near the copper surface. Thus, the data for secondary ion yield vs. beam energy at low energy may provide a very surface sensitive probe with high spatial resolution (monolayer) for investigating segregation near solid material surfaces. Compared with secondary ion signals

  4. FINAL FOCUS ION BEAM INTENSITY FROM TUNGSTEN FOIL CALORIMETER AND SCINTILLATOR IN NDCX-I

    SciTech Connect

    Lidia, S.M.; Bieniosek, F.; Henestroza, E.; Ni, P.; Seidl, P.

    2010-04-30

    Laboratory high energy density experiments using ion beam drivers rely upon the delivery of high-current, high-brightness ion beams with high peak intensity onto targets. Solid-state scintillators are typically used to measure the ion beam spatial profile but they display dose-dependent degradation and aging effects. These effects produce uncertainties and limit the accuracy of measuring peak beam intensities delivered to the target. For beam tuning and characterizing the incident beam intensity, we have developed a cross-calibrating diagnostic suite that extends the upper limit of measurable peak intensity dynamic range. Absolute intensity calibration is obtained with a 3 {micro}m thick tungsten foil calorimeter and streak spectrometer. We present experimental evidence for peak intensity measures in excess of 400 kW/cm{sup 2} using a 0.3 MV, 25 mA, 5-20 {micro}sec K{sup +1} beam. Radiative models and thermal diffusion effects are discussed because they affect temporal and spatial resolution of beam intensity profiles.

  5. Electrolytes with Improved Safety Characteristics for High Voltage, High Specific Energy Li-ion Cells

    NASA Technical Reports Server (NTRS)

    Smart, M. C.; Krause, F. C.; Hwang, C.; West, W. C.; Soler, J.; Whitcanack, L. W.; Prakash, G. K. S.; Ratnakumar, B. V.

    2012-01-01

    (1) NASA is actively pursuing the development of advanced electrochemical energy storage and conversion devices for future lunar and Mars missions; (2) The Exploration Technology Development Program, Energy Storage Project is sponsoring the development of advanced Li-ion batteries and PEM fuel cell and regenerative fuel cell systems for the Altair Lunar Lander, Extravehicular Activities (EVA), and rovers and as the primary energy storage system for Lunar Surface Systems; (3) At JPL, in collaboration with NASA-GRC, NASA-JSC and industry, we are actively developing advanced Li-ion batteries with improved specific energy, energy density and safety. One effort is focused upon developing Li-ion battery electrolyte with enhanced safety characteristics (i.e., low flammability); and (4) A number of commercial applications also require Li-ion batteries with enhanced safety, especially for automotive applications.

  6. Comparative Review of a Dozen National Energy Plans: Focus on Renewable and Efficient Energy

    SciTech Connect

    Logan, J.; James, T. L.

    2009-03-01

    Dozens of groups have submitted energy, environmental, and economic recovery plans for consideration by the Obama administration and the 111th Congress. This report provides a comparative analysis of 12 national proposals, focusing especially on energy efficiency (EE) and renewable energy (RE) market and policy issues.

  7. A Comparative Review of a Dozen National Energy Plans. Focus on Renewable and Efficient Energy

    SciTech Connect

    Logan, Jeffrey; James, Ted L.

    2009-03-01

    Dozens of groups have submitted energy, environmental, and economic recovery plans for consideration by the Obama administration and the 111th Congress. This report provides a comparative analysis of 12 national proposals, focusing especially on energy efficiency (EE) and renewable energy (RE) market and policy issues.

  8. Neutral beamline with improved ion-energy recovery

    SciTech Connect

    Dagenhart, W.K.; Haselton, H.H.; Stirling, W.L.; Whealton, J.H.

    1981-04-13

    A neutral beamline generator with unneutralized ion energy recovery is provided which enhances the energy recovery of the full energy ion component of the beam exiting the neutralizer cell of the beamline. The unneutralized full energy ions exiting the neutralizer are deflected from the beam path and the electrons in the cell are blocked by a magnetic field applied transverse to the beamline in the cell exit region. The ions, which are generated at essentially ground potential and accelerated through the neutralizer cell by a negative acceleration voltage, are collected at ground potential. A neutralizer cell exit end region is provided which allows the magnetic and electric fields acting on the exiting ions to be closely coupled. As a result, the fractional energy ions exiting the cell with the full energy ions are reflected back into the gas cell. Thus, the fractional energy ions do not detract from the energy recovery efficiency of full energy ions exiting the cell which can reach the ground potential interior surfaces of the beamline housing.

  9. US Heavy Ion Beam Research for Energy Density Physics Applicationsand Fusion

    SciTech Connect

    Davidson, R.C.; Logan, B.G.; Barnard, J.J.; Bieniosek, F.M.; Briggs, R.J.; Callahan D.A.; Kireeff Covo, M.; Celata, C.M.; Cohen, R.H.; Coleman, J.E.; Debonnel, C.S.; Grote, D.P.; Efthimiom, P.C.; Eylon, S.; Friedman, A.; Gilson, E.P.; Grisham, L.R.; Henestroza, E.; Kaganovich,I.D.; Kwan, J.W.; Lee, E.P.; Lee, W.W.; Leitner, M.; Lund, S.M.; Meier,W.R.; Molvik, A.W.; Olson, C.L.; Penn, G.E.; Qin, H.; Roy, P.K.; Rose,D.V.; Sefkow, A.; Seidl, P.A.; Sharp, W.M.; Startsev, E.A.; Tabak, M.; Thoma, C.; Vay, J-L; Wadron, W.L.; Wurtele, J.S.; Welch, D.R.; Westenskow, G.A.; Yu, S.S.

    2005-09-01

    Key scientific results from recent experiments, modeling tools, and heavy ion accelerator research are summarized that explore ways to investigate the properties of high energy density matter in heavy-ion-driven targets, in particular, strongly-coupled plasmas at 0.01 to 0.1 times solid density for studies of warm dense matter, which is a frontier area in high energy density physics. Pursuit of these near-term objectives has resulted in many innovations that will ultimately benefit heavy ion inertial fusion energy. These include: neutralized ion beam compression and focusing, which hold the promise of greatly improving the stage between the accelerator and the target chamber in a fusion power plant; and the Pulse Line Ion Accelerator (PLIA), which may lead to compact, low-cost modular linac drivers.

  10. US Heavy Ion Beam Research for High Energy Density Physics Applications and Fusion

    SciTech Connect

    Davidson, R.C.; Logan, B.G.; Barnard, J.J.; Bieniosek, F.M.; Briggs, R.J.; et al.

    2005-09-19

    Key scientific results from recent experiments, modeling tools, and heavy ion accelerator research are summarized that explore ways to investigate the properties of high energy density matter in heavy-ion-driven targets, in particular, strongly-coupled plasmas at 0.01 to 0.1 times solid density for studies of warm dense matter, which is a frontier area in high energy density physics. Pursuit of these near-term objectives has resulted in many innovations that will ultimately benefit heavy ion inertial fusion energy. These include: neutralized ion beam compression and focusing, which hold the promise of greatly improving the stage between the accelerator and the target chamber in a fusion power plant; and the Pulse Line Ion Accelerator (PLIA), which may lead to compact, low-cost modular linac drivers.

  11. Through-silicon via plating void metrology using focused ion beam mill

    NASA Astrophysics Data System (ADS)

    Rudack, A. C.; Nadeau, J.; Routh, R.; Young, R. J.

    2012-03-01

    3D IC integration continues to increase in complexity, employing advanced interconnect technologies such as throughsilicon vias (TSVs), wafer-to-wafer (W2W) bonding, and multi-chip stacking. As always, the challenge with developing new processes is to get fast, effective feedback to the integration engineer. Ideally this data is provided by nondestructive in-line metrology, but this is not always possible. For example, some form of physical cross-sectioning is still the most practical way to detect and characterize TSV copper plating voids. This can be achieved by cleaving, followed by scanning electron microscope (SEM) inspection. A more effective physical cross-sectioning method has been developed using an automated dual-beam focused ion beam (FIB)-SEM system, in which multiple locations can be sectioned and imaged while leaving the wafer intact. This method has been used routinely to assess copper plating voids over the last 24 months at SEMATECH. FIB-SEM feedback has been used to evaluate new plating chemistries, plating recipes, and process tool requalification after downtime. The dualbeam FIB-SEM used for these studies employs a gallium-based liquid metal ion source (LMIS). The overall throughput of relatively large volumes being milled is limited to 3-4 hours per section due to the maximum available beam current of 20 nA. Despite the larger volumetric removal rates of other techniques (e.g., mechanical polishing, broad-ion milling, and laser ablation), the value of localized, site-specific, and artifact-free FIB milling is well appreciated. The challenge, therefore, has been to reap the desired FIB benefits, but at faster volume removal rates. This has led to several system and technology developments for improving the throughput of the FIB technique, the most recent being the introduction of FIBs based on an inductively coupled plasma (ICP) ion source. The ICP source offers much better performance than the LMIS at very high beam currents, enabling more than

  12. Charge state dependence of channeled ion energy loss

    NASA Astrophysics Data System (ADS)

    Golovchenko, J. A.; Goland, A. N.; Rosner, J. S.; Thorn, C. E.; Wegner, H. E.; Knudsen, H.; Moak, C. D.

    1981-02-01

    The charge state dependence of channeled ion energy loss has been determined for a series of ions ranging from fluorine to chlorine along the <110> direction in a silicon crystal. Energy losses for both bare ions and ions partially clothed with bound electrons at EA≅3 MeV/amu have been measured. The energy-loss rate for bare ions follows a strict Z21 scaling and agrees reasonably well with quantal perturbation calculations without the need for polarization or Bloch corrections. An explanation for this result is discussed. The clothed-ion energy losses appear to demonstrate screening effects that agree qualitatively with simple estimates. The angular dependence of the observed energy-loss effects is also presented.

  13. Research and development toward heavy ion driven inertial fusion energy

    NASA Astrophysics Data System (ADS)

    Seidl, Peter A.; Barnard, John J.; Faltens, Andris; Friedman, Alex

    2013-02-01

    We describe near-term heavy ion fusion (HIF) research objectives associated with developing an inertial fusion energy demonstration power plant. The goal of this near-term research is to lay the essential groundwork for an intermediate research experiment (IRE), designed to demonstrate all the key driver beam manipulations at a meaningful scale, and to enable HIF relevant target physics experiments. This is a very large step in size and complexity compared to HIF experiments to date, and if successful, it would justify proceeding to a demonstration fusion power plant. With an emphasis on accelerator research, this paper is focused on the most important near-term research objectives to justify and to reduce the risks associated with the IRE. The chosen time scale for this research is 5-10 years, to answer key questions associated with the HIF accelerator drivers, in turn enabling a key decision on whether to pursue a much more ambitious and focused inertial fusion energy research and development program. This is consistent with the National Academies of Sciences Review of Inertial Fusion Energy Systems Interim Report, which concludes that “it would be premature at the present time to choose a particular driver approach…” and encouraged the continued development of community consensus on critical issues, and to develop “options for a community-based roadmap for the development of inertial fusion as a practical energy source.”

  14. Mixed Waste Focus Area: Department of Energy complex needs report

    SciTech Connect

    Roach, J.A.

    1995-11-16

    The Assistant Secretary for the Office of Environmental Management (EM) at the US Department of Energy (DOE) initiated a new approach in August of 1993 to environmental research and technology development. A key feature of this new approach included establishment of the Mixed Waste Characterization, Treatment, and Disposal Focus Area (MWFA). The mission of the MWFA is to identify, develop, and implement needed technologies such that the major environmental management problems related to meeting DOE`s commitments for treatment of mixed wastes under the Federal Facility Compliance Act (FFCA), and in accordance with the Land Disposal Restrictions (LDR) of the Resource Conservation and Recovery Act (RCRA), can be addressed, while cost-effectively expending the funding resources. To define the deficiencies or needs of the EM customers, the MWFA analyzed Proposed Site Treatment Plans (PSTPs), as well as other applicable documents, and conducted site visits throughout the summer of 1995. Representatives from the Office of Waste Management (EM-30), the Office of Environmental Restoration (EM-40), and the Office of Facility Transition and Management (EM-60) at each site visited were requested to consult with the Focus Area to collaboratively define their technology needs. This report documents the needs, deficiencies, technology gaps, and opportunities for expedited treatment activities that were identified during the site visit process. The defined deficiencies and needs are categorized by waste type, namely Wastewaters, Combustible Organics, Sludges/Soils, Debris/Solids, and Unique Wastes, and will be prioritized based on the relative affect the deficiency has on the DOE Complex.

  15. Characterization of Meteorites by Focused Ion Beam Sectioning: Recent Applications to CAIs and Primitive Meteorite Matrices

    NASA Technical Reports Server (NTRS)

    Christoffersen, Roy; Keller, Lindsay P.; Han, Jangmi; Rahman, Zia; Berger, Eve L.

    2015-01-01

    Focused ion beam (FIB) sectioning has revolutionized preparation of meteorite samples for characterization by analytical transmission electron microscopy (TEM) and other techniques. Although FIB is not "non-destructive" in the purest sense, each extracted section amounts to no more than nanograms (approximately 500 cubic microns) removed intact from locations precisely controlled by SEM imaging and analysis. Physical alteration of surrounding material by ion damage, fracture or sputter contamination effects is localized to within a few micrometers around the lift-out point. This leaves adjacent material intact for coordinate geochemical analysis by SIMS, microdrill extraction/TIMS and other techniques. After lift out, FIB sections can be quantitatively analyzed by electron microprobe prior to final thinning, synchrotron x-ray techniques, and by the full range of state-of-the-art analytical field-emission scanning transmission electron microscope (FE-STEM) techniques once thinning is complete. Multiple meteorite studies supported by FIB/FE-STEM are currently underway at NASA-JSC, including coordinated analysis of refractory phase assemblages in CAIs and fine-grained matrices in carbonaceous chondrites. FIB sectioning of CAIs has uncovered epitaxial and other overgrowth relations between corundum-hibonite-spinel consistent with hibonite preceding corundum and/or spinel in non-equilibrium condensation sequences at combinations of higher gas pressures, dust-gas enrichments or significant nebular transport. For all of these cases, the ability of FIB to allow for coordination with spatially-associated isotopic data by SIMS provides immense value for constraining the formation scenarios of the particular CAI assemblage. For carbonaceous chondrites matrix material, FIB has allowed us to obtain intact continuous sections of the immediate outer surface of Murchison (CM2) after it has been experimentally ion processed to simulate solar wind space weathering. The surface

  16. A novel EPROM device fabricated using focused boron ion-beam implantation

    SciTech Connect

    Shukuri, S.; Wada, Y.; Hagiwara, T.; Komori, K.; Tamura, M.

    1987-06-01

    A novel floating-gate avalanche injection (FAMOS) type erasable programmable read-only memory (EPROM) device is demonstrated, with a heavily focused ion-beam (FIB) implanted region of about 0.2-..mu..m width at the drain edge of the channel. This heavily B/sup +/-doped region permits a higher electric field near the drain edge, resulting in a remarkable increase of the hot-carrier generation rate, and reduces both the programming voltage and programming time. A three-dimensional device simulator, CADDETH, predicted that the electric field at the drain edge would increase by about six times, which would lead to hot-carrier generation efficiency three orders of magnitude higher.

  17. Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

    SciTech Connect

    Overweg, H. C.; Haan, A. M. J. den; Eerkens, H. J.; Bossoni, L.; Oosterkamp, T. H.; Alkemade, P. F. A.; La Rooij, A. L.; Spreeuw, R. J. C.

    2015-08-17

    We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10{sup −12} Am{sup 2}, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.

  18. Liquid-like instabilities in gold nanowires fabricated by focused ion beam lithography

    NASA Astrophysics Data System (ADS)

    Naik, J. P.; Das, K.; Prewett, P. D.; Raychaudhuri, A. K.; Chen, Yifang

    2012-10-01

    Observation of liquid-like instabilities is reported in Au nanowires formed by nanopatterning of Au films using focused ion beam (FIB) on different types of Si substrates including those passivated with SiO2 or Si3N4 surfaces. The onset of the instability, which can ultimately lead to break up of the FIB patterned nanowires into gold islands, occurs when the diameter of the nanowire is below a critical range, which depends on the conductivity of the substrate and the extent of native oxide present on it. We also observe the formation of Taylor cones on very narrow nanowires grown on insulating substrates at the onset of instabilities. This effect is further strong evidence of liquid behaviour and is the result of charging of the wires during FIB nanofabrication.

  19. Optimized electrode placement along the channel of a Hall thruster for ion focusing

    SciTech Connect

    Qing, Shaowei; E, Peng; Xia, Guangqing; Tang, Ming-Chun; Duan, Ping

    2014-01-21

    An optimal placement of the segmented electrode for increasing the lifetime of the Aton-type Hall thruster, i.e., reducing the plume divergence, is demonstrated using a 2D3V fully kinetic Particle-in-Cell method. Segmented electrodes, embedded near the ionization region of non-segmented case and biased above anode potential, lead to an increased separation between the ionization and acceleration regions and the formation of an efficient acceleration electric field configuration as potential lens. Due to this electrode placement, the sheath near the ceramic walls of the acceleration region is collapsed and an excellent ion beam focusing is demonstrated. The potential contour pockets around the electrodes and the sheath collapse phenomenon are also discussed.

  20. Three-dimensional microstructural characterization of bulk plutonium and uranium metals using focused ion beam technique

    NASA Astrophysics Data System (ADS)

    Chung, Brandon W.; Erler, Robert G.; Teslich, Nick E.

    2016-05-01

    Nuclear forensics requires accurate quantification of discriminating microstructural characteristics of the bulk nuclear material to identify its process history and provenance. Conventional metallographic preparation techniques for bulk plutonium (Pu) and uranium (U) metals are limited to providing information in two-dimension (2D) and do not allow for obtaining depth profile of the material. In this contribution, use of dual-beam focused ion-beam/scanning electron microscopy (FIB-SEM) to investigate the internal microstructure of bulk Pu and U metals is demonstrated. Our results demonstrate that the dual-beam methodology optimally elucidate microstructural features without preparation artifacts, and the three-dimensional (3D) characterization of inner microstructures can reveal salient microstructural features that cannot be observed from conventional metallographic techniques. Examples are shown to demonstrate the benefit of FIB-SEM in improving microstructural characterization of microscopic inclusions, particularly with respect to nuclear forensics.

  1. Fabrication of nanoelectrodes for neurophysiology: cathodic electrophoretic paint insulation and focused ion beam milling

    PubMed Central

    Qiao, Yi; Chen, Jie; Guo, Xiaoli; Cantrell, Donald; Ruoff, Rodney; Troy, John

    2005-01-01

    The fabrication and characterization of tungsten nanoelectrodes insulated with cathodic electrophoretic paint is described together with their application within the field of neurophysiology. The tip of a 127 μm diameter tungsten wire was etched down to less than 100 nm and then insulated with cathodic electrophoretic paint. Focused ion beam (FIB) polishing was employed to remove the insulation at the electrode’s apex, leaving a nanoscale sized conductive tip of 100–1000 nm. The nanoelectrodes were examined by scanning electron microscopy (SEM) and their electrochemical properties characterized by steady state linear sweep voltammetry. Electrode impedance at 1 kHz was measured too. The ability of a 700 nm tipped electrode to record well-isolated action potentials extracellularly from single visual neurons in vivo was demonstrated. Such electrodes have the potential to open new populations of neurons to study. PMID:16467926

  2. Focused-ion-beam-assisted fabrication of polymer rolled-up microtubes

    NASA Astrophysics Data System (ADS)

    Luchnikov, V.; Stamm, M.; Akhmadaliev, Ch; Bischoff, L.; Schmidt, B.

    2006-08-01

    A focused ion beam (FIB) has been applied to the fabrication of polymer microtubes via the rolling-up technique from poly(4-vinyl pyridine)/polystyrene bilayer films deposited on the top of a sacrificial aluminum layer covering a silicon wafer. The bending forces in the film arise due to different swelling of the bilayer components in acidic water and lead to rolling of the film. The dimensions and position of the rolled-up tubes can be controlled by FIB milling (sputtering) of geometrically well-adjusted openings in the polymer films. This technique can be applied to the structuring of scrolled films formed from different materials without the use of lithographically patterned photoresists. The geometrical patterning of the tube interior can also be done by FIB irradiation.

  3. First demonstration of X-ray mirrors using focused ion beam

    NASA Astrophysics Data System (ADS)

    Numazawa, Masaki; Ezoe, Yuichiro; Ishikawa, Kumi; Ogawa, Tomohiro; Sato, Mayu; Nakamura, Kasumi; Takeuchi, Kazuma; Terada, Masaru; Ohashi, Takaya; Mitsuda, Kazuhisa; Kelley, Ron; Murata, Kaoru

    2016-06-01

    We report on novel X-ray mirrors fabricated with a focused ion beam for future astronomical missions. We fabricated a test sample from a silicon wafer by forming six slits whose sidewalls were used as X-ray reflection surfaces. The six slits were designed with a size of 25 × 300 × 170 µm3 and with different inclination angles of 0 and ±1°. We examined X-ray reflection using three slits with different inclination angles at Al Kα 1.49 keV. Consequently, we demonstrated X-ray reflection from all the three slits. All the sidewalls have multiangular components with a microroughness of ˜1 nm rms. ˜30-45% of the total surface area is effective for X-ray reflection. We confirmed that the inclination angles are consistent with the designed values.

  4. Three-dimensional microstructural characterization of bulk plutonium and uranium metals using focused ion beam technique

    DOE PAGES

    Chung, Brandon W.; Erler, Robert G.; Teslich, Nick E.

    2016-03-03

    Nuclear forensics requires accurate quantification of discriminating microstructural characteristics of the bulk nuclear material to identify its process history and provenance. Conventional metallographic preparation techniques for bulk plutonium (Pu) and uranium (U) metals are limited to providing information in two-dimension (2D) and do not allow for obtaining depth profile of the material. In this contribution, use of dual-beam focused ion-beam/scanning electron microscopy (FIB-SEM) to investigate the internal microstructure of bulk Pu and U metals is demonstrated. Our results demonstrate that the dual-beam methodology optimally elucidate microstructural features without preparation artifacts, and the three-dimensional (3D) characterization of inner microstructures can revealmore » salient microstructural features that cannot be observed from conventional metallographic techniques. As a result, examples are shown to demonstrate the benefit of FIB-SEM in improving microstructural characterization of microscopic inclusions, particularly with respect to nuclear forensics.« less

  5. Fabrication of visibly photoluminescent Si microstructures by focused ion beam implantation and wet etching

    NASA Astrophysics Data System (ADS)

    Xu, J.; Steckl, A. J.

    1994-10-01

    A technique is reported for the fabrication of optically active Si microstructures embedded in a crystalline Si (c-Si) substrate. The process combines Si microstructure fabrication by localized high dose Ga+ (1016/cm2) focused ion beam (FIB) implantation at 30 kV into n-type (100) Si followed by anisotropic etching in KOH:H2O (1:5 by volume). Self-selective porous Si (PoSi) formation of the microstructures is obtained by stain etching in HF:HNO3:H2O (1:3:5 by volume). Upon UV 365 nm or Ar+ 488 nm excitation, selective visible room-temperature photoluminescence (PL) was observed from the Si microstructures only. The PL, peaked at ˜670 nm with a full width at half-magnitude (FWHM) of ˜130 nm, is similar to that of PoSi obtained from c-Si substrate.

  6. Ion transit through capacitively coupled Ar sheaths: Ion current and energy distribution

    NASA Astrophysics Data System (ADS)

    Greene, W. M.; Hartney, M. A.; Oldham, W. G.; Hess, D. W.

    1988-03-01

    The ion current and ion energy distribution (IED) of Ar+ and ArH+ impinging on a grounded surface immersed in capacitively coupled Ar plasmas have been measured as a function of pressure, applied rf voltage amplitude (Vrf), interelectrode gap, and sampling orifice size. A maximum in ion current occurs at high Vrf and intermediate electrode spacing. rf modulation of the collisionless IED occurs at high pressure and high Vrf and is caused by reduction of the sheath dimension under these conditions. Collisional shift to lower ion energy is also noted at high pressure. A low-energy peak at ˜10 eV is observed under high pressure and ion current conditions. Larger orifice sizes increase the collisions occurring downstream from the orifice as indicated by collisional energy shifts in the IED and a decrease in ion current density.

  7. Controllable Laser Ion Acceleration

    NASA Astrophysics Data System (ADS)

    Kawata, S.; Kamiyama, D.; Ohtake, Y.; Takano, M.; Barada, D.; Kong, Q.; Wang, P. X.; Gu, Y. J.; Wang, W. M.; Limpouch, J.; Andreev, A.; Bulanov, S. V.; Sheng, Z. M.; Klimo, O.; Psikal, J.; Ma, Y. Y.; Li, X. F.; Yu, Q. S.

    2016-02-01

    In this paper a future laser ion accelerator is discussed to make the laser-based ion accelerator compact and controllable. Especially a collimation device is focused in this paper. The future laser ion accelerator should have an ion source, ion collimators, ion beam bunchers, and ion post acceleration devices [Laser Therapy 22, 103(2013)]: the ion particle energy and the ion energy spectrum are controlled to meet requirements for a future compact laser ion accelerator for ion cancer therapy or for other purposes. The energy efficiency from the laser to ions is improved by using a solid target with a fine sub-wavelength structure or a near-critical density gas plasma. The ion beam collimation is performed by holes behind the solid target or a multi-layered solid target. The control of the ion energy spectrum and the ion particle energy, and the ion beam bunching would be successfully realized by a multistage laser-target interaction.

  8. Gaussian energy distribution of fast ions emitted by laser-produced plasmas

    NASA Astrophysics Data System (ADS)

    Krása, J.

    2013-05-01

    The analysis of ion collector signals with the use of a time-of-fight signal function derived from a shifted Maxwell-Boltzmann velocity distribution is used to quantify the ion characteristics as the ion temperature and velocity of centre-of-mass motion of groups of ionized species constituting the ablated plasma. The analysis is also focused on velocity and energy distributions derived from the signal of a time-of-flight detector taking into account the underlying principle of sensor operation. The energy Maxwell spectra of ions are compared with the Gauss distribution with respect to the ratio of the centre-of-mass energy of ions to their temperature. The difference threshold between the Gauss and energy Maxwell spectra is determined via the limited validity of the basic relationship between spreads in energy and time-of-flight spectra ½ΔE/E = Δt/t. The analysis of velocity spectrum of fast ions emitted by Ti plasma produced with 300 ps, kJ-class iodine laser operating at PALS facility shows that ion bursts consist of almost monoenergetic ion beams.

  9. Theoretical studies of the ion-hose instability in a plasma-focused free-electron laser

    SciTech Connect

    Whittum, D.H.; Hiramatsu, Shigenori ); Kim, Jinsoo )

    1993-02-01

    AN ion-focused' relativistic electron beam traversing a magnetic wiggler is subject to a transverse two-stream or ion-hose' instability, resulting from the coupling of transverse displacements of the beam centroid to the slosh' motion of the (beam-focused) nonneutral ion plasma, and driven by the V x B' deflection in the wiggler field. The equations of motion are resolved into an inhomogeneous beam break-up' equation and asymptotic growth is computed in the limit of linear focusing. The effect of nonlinearities is assessed numerically with a distributed mass' model. As examples, the authors consider ion-hose growth ina UV FEL and microwave FEL two-beam accelerator.'

  10. Formation of multi-charged ion beams by focusing effect of mid-electrode on electron cyclotron resonance ion source

    SciTech Connect

    Imai, Youta Kimura, Daiju; Kurisu, Yosuke; Nozaki, Dai; Yano, Keisuke; Kumakura, Sho; Sato, Fuminobu; Kato, Yushi; Iida, Toshiyuki

    2014-02-15

    We are constructing a tandem type electron cyclotron resonance ion source (ECRIS) and a beam line for extracting ion beams. The ion beam is extracted from the second stage by an accel-decel extraction system with a single-hole and the ion beam current on each electrode is measured. The total ion beam current is measured by a faraday cup downstream the extraction electrodes. We measure these currents as a function of the mid-electrode potential. We also change the gap length between electrodes and perform similar measurement. The behaviors of these currents obtained experimentally against the mid-electrode potential show qualitatively good agreement with a simple theoretical consideration including sheath potential effects. The effect of mid-electrode potential is very useful for decreasing the beam loss for enhancing ion beam current extracted from ECRIS.

  11. The energy transfer in the TEMP-4M pulsed ion beam accelerator

    SciTech Connect

    Isakova, Y. I.; Pushkarev, A. I.; Khaylov, I. P.

    2013-07-15

    The results of a study of the energy transfer in the TEMP-4M pulsed ion beam accelerator are presented. The energy transfer efficiency in the Blumlein and a self-magnetically insulated ion diode was analyzed. Optimization of the design of the accelerator allows for 85% of energy transferred from Blumlein to the diode (including after-pulses), which indicates that the energy loss in Blumlein and spark gaps is insignificant and not exceeds 10%–12%. Most losses occur in the diode. The efficiency of energy supplied to the diode to the energy of accelerated ions is 8%–9% for a planar strip self-magnetic MID, 12%–15% for focusing diode and 20% for a spiral self-magnetic MID.

  12. Dense Plasma Focus With High Energy Helium Beams for Radiological Source Replacement

    NASA Astrophysics Data System (ADS)

    Schmidt, Andrea; Ellsworth, Jennifer; Falabella, Steve; Link, Anthony; Rusnak, Brian; Sears, Jason; Tang, Vincent

    2014-10-01

    A dense plasma focus (DPF) is a compact accelerator that can produce intense high energy ion beams (multiple MeV). It could be used in place of americium-beryllium (AmBe) neutron sources in applications such as oil well logging if optimized to produce high energy helium beams. AmBe sources produce neutrons when 5.5 MeV alphas emitted from the Am interact with the Be. However, due to the very small alpha-Be cross section for alphas <2 MeV, an AmBe source replacement would have to accelerate ~0.15 μC of He to 2 + MeV in order to produce 107 neutrons per pulse. We are using our particle in cell (PIC) model in LSP of a 4 kJ dense plasma focus discharge to guide the optimization of a compact DPF for the production of high-energy helium beam. This model is fluid for the run-down phase, and then transitions to fully kinetic prior to the pinch in order to include kinetic effects such as ion beam formation and anomalous resistivity. An external pulsed-power driver circuit is used at the anode-cathode boundary. Simulations will be benchmarked to He beam measurements using filtered and time-of-flight Faraday cup diagnostics. This work performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344. This work supported by US DOE/NA-22 Office of Non-proliferation Research and Development. Computing support for this work came from the LLNL Institutional Computing Grand Challenge program.

  13. Damages of Carbon-Tungsten Samples under Influence of Deuterium Ions and Dense Plasma Streams within Plasma-Focus Facility

    SciTech Connect

    Gribkov, V. A.; Grebenschikova, Ye. S.; Dubrovsky, A. V.; Makeev, O. N.; Rogozhkin, S. V.; Zaluzhnij, A. G.; Demina, Ye. V.; Kovtun, A. V.; Maslayev, S. A.; Pimenov, V. N.; Malinowski, K.; Skladnik-Sadowska, E.; Paduch, M.; Scholz, M.; Sadowski, M. J.

    2008-03-19

    The paper reports on experimental studies of processes of the interaction of pulsed streams of fast deuterium ions (E{sub i}{approx}100 keV) and dense deuterium plasma (v{sub pl}>10{sup 7} cm/s) with samples made of carbon and tungsten. Experiments were performed in the large PF-1000 plasma-focus facility with the charging energy of 481 kJ and with the pure deuterium filling. Power flux density of plasma/ions streams was q = 10{sup 7}-10{sup 10} W/cm{sup 2} and the pulse length was from 10{sup -7} s to 10{sup -6} s, whereas the duration of heat pulses (due to a secondary plasma at the target's surface) was 10{sup -4} s. The stainless steel, tungsten and carbon-tungsten samples were placed in the zone of their strong melting and evaporation or in the zone without their melting. Each sample was exposed to 1 through 10 discharges, and the irradiated samples were investigated with optical-, electron- and atomic-force-microscopes. The interaction of intense plasma-ion pulses with the carbon-tungsten samples caused the formation of a wave-like relief on sample surfaces, the evident erosion of the sample material, and the creation of numerous micro-cracks. It was also found that about 200-nm-thick layer of the irradiated tungsten sample contained many melted fragments of nm-dimensions. The results might be useful for estimations of tungsten behavior in extreme situations (e.g. disruptions) expected in fusion reactors with magnetic plasma confinement.

  14. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams

    DOE PAGES

    Iberi, Vighter; Liang, Liangbo; Ievlev, Anton V.; Stanford, Michael G.; Lin, Ming-Wei; Li, Xufan; Mahjouri-Samani, Masoud; Jesse, Stephen; Sumpter, Bobby G.; Kalinin, Sergei V.; et al

    2016-08-02

    Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at atomic level. We demonstrate He+ beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and thereby increases the Young s modulus of elasticity. Furthermore, we observe formore » the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at room temperature. In conclusion, the approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region.« less

  15. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams.

    PubMed

    Iberi, Vighter; Liang, Liangbo; Ievlev, Anton V; Stanford, Michael G; Lin, Ming-Wei; Li, Xufan; Mahjouri-Samani, Masoud; Jesse, Stephen; Sumpter, Bobby G; Kalinin, Sergei V; Joy, David C; Xiao, Kai; Belianinov, Alex; Ovchinnikova, Olga S

    2016-08-02

    Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction the of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at the atomic level. We demonstrate He(+) beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and increases the Young's modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at the room temperature. The approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region.

  16. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams.

    PubMed

    Iberi, Vighter; Liang, Liangbo; Ievlev, Anton V; Stanford, Michael G; Lin, Ming-Wei; Li, Xufan; Mahjouri-Samani, Masoud; Jesse, Stephen; Sumpter, Bobby G; Kalinin, Sergei V; Joy, David C; Xiao, Kai; Belianinov, Alex; Ovchinnikova, Olga S

    2016-01-01

    Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction the of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at the atomic level. We demonstrate He(+) beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and increases the Young's modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at the room temperature. The approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region. PMID:27480346

  17. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams

    PubMed Central

    Iberi, Vighter; Liang, Liangbo; Ievlev, Anton V.; Stanford, Michael G.; Lin, Ming-Wei; Li, Xufan; Mahjouri-Samani, Masoud; Jesse, Stephen; Sumpter, Bobby G.; Kalinin, Sergei V.; Joy, David C.; Xiao, Kai; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-01-01

    Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction the of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at the atomic level. We demonstrate He+ beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and increases the Young’s modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at the room temperature. The approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region. PMID:27480346

  18. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams

    NASA Astrophysics Data System (ADS)

    Iberi, Vighter; Liang, Liangbo; Ievlev, Anton V.; Stanford, Michael G.; Lin, Ming-Wei; Li, Xufan; Mahjouri-Samani, Masoud; Jesse, Stephen; Sumpter, Bobby G.; Kalinin, Sergei V.; Joy, David C.; Xiao, Kai; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-08-01

    Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction the of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at the atomic level. We demonstrate He+ beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and increases the Young’s modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at the room temperature. The approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region.

  19. ELISA - an electrostatic storage ring for low-energy ions

    NASA Astrophysics Data System (ADS)

    Pape Moeller, Soeren

    1997-05-01

    The design of a new type of storage ring for low-energy ions using electrostatic deflection and focusing devices is described. Electrostatic bends and quadrupoles are used since they are more efficient than magnetic ones for low-velocity heavy ions. Furthermore, electrostatic devices are more compact and easier to construct than magnetic devices. In comparison to an electromagnetic trap, one important advantage of the elecrostatic ring is the easy access to the circulating beam and its decay products. These and other features, e.g. no magnetic fields, makes such storage devices attractive for many atomic-physics experiments. Also neigboring fields as chemistry and biology might benefit from such an relatively inexpensive device. One important difference between an electrostatic and a magnetic ring is, that the longitudinal energy is not conserved for the electrostatic ring. The actual ring will have a race-track shape as defined by two straight sections each with two quadrupole doublets connected by 180-degrees bends. The bends will consist of 160-degrees spherical deflection plates surrounded by two parallel plate 10-degrees bends. The storage ring ELISA, currently being built, will have a circumference of 6 meters. The first beam tests will take place during summer 1996.

  20. Electron scattering from HeII ions at intermediate energies

    NASA Astrophysics Data System (ADS)

    McLaughlin, B. M.; Scott, M. P.; Burke, P. G.; Dahler, J. S.

    1997-04-01

    Electron collisional excitation cross sections and rate coefficients of HeII ions are of extreme interest in the modelling of astrophysical plasmas. They are required for reliable determination of the excitation and ionization in the solar corona, impulsive heating events in the solar transitions region, shock waves in the interstellar medium and in stellar atmospheres. Emission lines of HeII have been observed in a variety of solar and astrophysical objects at wavelengths below 350 ÅThe Extreme Ultra Violet Explorer (EUVE) spectra of Capella (HD 3402, G8 III + G0 III), the bright RS CVn binary system, is dominated by HeII (λ 303 Åand high ionization stages of iron. Accurate knowledge of the electron collisional excitation rates for the n = 2 and n = 3 levels of HeII are required in the modelling of the electron-ion equilibration in non-radiative shocks associated with SN 1006. Recently attention has focused on scattering at intermediate energies with emphasis on the n = 2 levels using the CCC formalism and the 2D-Rmatrix propagator method. In our work we have used the IERM approach of Burke, Scott and co-workers to obtain accurate cross sections for levels up to n = 3, as this has proved successful in dealing with electron - atomic hydrogen scattering at intermediate energies. A comprehensive set of results will be presented at the meeting.

  1. A New Focus Lens for Improved Energy Resolution in the Wind and Temperature Spectrometer

    NASA Astrophysics Data System (ADS)

    Fenn, D.; Herrero, F.; Syrstad, E. A.

    2010-12-01

    The Wind and Temperature Spectrometer (WATS) is a novel neutral particle sensor capable of simultaneously measuring neutral winds, temperature, composition, and density in the upper atmosphere. This compact, low-power instrument is ideally suited for in situ thermospheric measurements on small-satellite platforms. Building on work previously performed, we detail here endeavors to more fully characterize the effects of proposed instrument modifications, leading to a greater understanding of their impact on overall sensor performance. Additionally, laboratory testing of the WATS seeks to confirm theoretical data previously gathered. WATS utilizes electron impact ionization, a crossed Small Deflection Energy Analyzer (SDEA) pair, and a microchannel plate (MCP) detector with linear spatial readout to measure the full 3-D velocity distribution of an incoming neutral stream. A minor weakness in the original WATS design was that a large ion beam divergence at the SDEA entrance led to degraded energy resolution. To address this problem, a simple focusing lens system with a large acceptance angle range, dubbed the Tapered Quad Deflector (TQD), was designed and previously presented. Here, the results of ion trajectory calculations (Simion 3D) and Monte Carlo simulations (Matlab) are used to explore various aspects of the TQD’s functionality. With no modifications to the instrument aside from the addition of the TQD, simulations show an increase in the energy resolution by a factor of two. Further simulations reveal that reducing the width of the instrument’s collimator slit decreases the beam divergence (with a corresponding increase in instrument energy resolution) for both the original and modified WATS. However, this effect is markedly more pronounced in the latter, meaning that the TQD could enable a significant reduction in beam divergence while minimizing the loss of signal that would result from narrowing the collimator slit. Also presented are the results of

  2. Cathode spot energy transfer simulated by a focused laser beam

    SciTech Connect

    Vogel, N.; Hoft, H. )

    1989-10-01

    Minimum conditions for the formation of surface craters by laser irradiation have been studied experimentally and theoretically for various metals. The critical power density for crater formation within 20 ns was about 10{sup 11}W/m{sup 2}. It is therefore concluded that crater formation by ion bombardment will require an ion current density of the order of 10{sup 10}A/m{sup 2}.

  3. Subsurface Examination of a Foliar Biofilm Using Scanning Electron- and Focused-Ion-Beam Microscopy

    SciTech Connect

    Wallace, Patricia K.; Arey, Bruce W.; Mahaffee, Walt F.

    2011-08-01

    The dual beam scanning electron microscope, equipped with both a focused ion- and scanning electron- beam (FIB SEM) is a novel tool for the exploration of the subsurface structure of biological tissues. The FIB can remove a predetermined amount of material from a selected site to allow for subsurface exploration and when coupled with SEM or scanning ion- beam microscopy (SIM) could be suitable to examine the subsurface structure of bacterial biofilms on the leaf surface. The suitability of chemical and cryofixation was examined for use with the FIB SEM to examine bacterial biofilms on leaf surfaces. The biological control agent, Burkholderia pyroccinia FP62, that rapidly colonizes the leaf surface and forms biofilms, was inoculated onto geranium leaves and incubated in a greenhouse for 7 or 14 days. Cryofixation was not suitable for examination of leaf biofilms because it created a frozen layer over the leaf surface that cracked when exposed to the electron beam and the protective cap required for FIB milling could not be accurately deposited. With chemically fixed samples, it was possible to precisely FIB mill a single cross section (5 µm) or sequential cross sections from a single site without any damage to the surrounding surface. Biofilms, 7 days post-inoculation (DPI), were composed of 2 to 5 bacterial cell layers while biofilms 14 DPI ranged from 5 to greater than 30 cell layers. Empty spaces between bacteria cells in the subsurface structure were observed in biofilms 7- and 14-DPI. Sequential cross sections inferred that the empty spaces were often continuous between FP62 cells and could possibly make up a network of channels throughout the biofilm. FIB SEM was a useful tool to observe the subsurface composition of a foliar biofilm.

  4. Terascale simulations for heavy ion inertial fusion energy

    SciTech Connect

    Friedman, A; Cohen, R H; Grote, D P; Sharp, W M; Celata, C M; Lee, E P; Vay, J-L; Davidson, R C; Kaganovich, I; Lee, W W; Qin, H; Welch, D R; Haber, I; Kishek, R A

    2000-06-08

    The intense ion beams in a heavy ion Inertial Fusion Energy (IFE) driver and fusion chamber are non-neutral plasmas whose dynamics are largely dominated by space charge. We propose to develop a ''source-to-target'' Heavy Ion Fusion (HIF) beam simulation capability: a description of the kinetic behavior of this complex, nonlinear system which is both integrated and detailed. We will apply this new capability to further our understanding of key scientific issues in the physics of ion beams for IFE. The simulations will entail self-consistent field descriptions that require interprocessor communication, but are scalable and will run efficiently on terascale architectures. This new capability will be based on the integration of three types of simulations, each requiring terascale computing: (1) simulations of acceleration and confinement of the space-charge-dominated ion beams through the driver (accelerator, pulse compression line, and final focusing system) which accurately describe their dynamics, including emittance growth (phase-space dilution) effects; these are particle-in-cell (PIC) models; (2) electromagnetic (EM) and magnetoinductive (Darwin) simulations which describe the beam and the fusion chamber environment, including multibeam, neutralization, stripping, beam and plasma ionization processes, and return current effects; and (3) highly detailed simulations (6f, multispecies PIC, continuum Vlasov), which can examine electron effects and collective modes in the driver and chamber, and can study halo generation with excellent statistics, to ensure that these effects do not disrupt the focusability of the beams. The code development will involve: (i) adaptation of existing codes to run efficiently on multi-SMP computers that use a hybrid of shared and distributed memory; (ii) development of new and improved numerical algorithms, e.g., averaging techniques that will afford larger timesteps; and (iii) incorporation of improved physics models (e.g., for self

  5. Detection of Nitro-Based and Peroxide-Based Explosives by Fast Polarity-Switchable Ion Mobility Spectrometer with Ion Focusing in Vicinity of Faraday Detector

    PubMed Central

    Zhou, Qinghua; Peng, Liying; Jiang, Dandan; Wang, Xin; Wang, Haiyan; Li, Haiyang

    2015-01-01

    Ion mobility spectrometer (IMS) has been widely deployed for on-site detection of explosives. The common nitro-based explosives are usually detected by negative IMS while the emerging peroxide-based explosives are better detected by positive IMS. In this study, a fast polarity-switchable IMS was constructed to detect these two explosive species in a single measurement. As the large traditional Faraday detector would cause a trailing reactant ion peak (RIP), a Faraday detector with ion focusing in vicinity was developed by reducing the detector radius to 3.3 mm and increasing the voltage difference between aperture grid and its front guard ring to 591 V, which could remove trailing peaks from RIP without loss of signal intensity. This fast polarity-switchable IMS with ion focusing in vicinity of Faraday detector was employed to detect a mixture of 10 ng 2,4,6-trinitrotoluene (TNT) and 50 ng hexamethylene triperoxide diamine (HMTD) by polarity-switching, and the result suggested that [TNT-H]− and [HMTD+H]+ could be detected in a single measurement. Furthermore, the removal of trailing peaks from RIP by the Faraday detector with ion focusing in vicinity also promised the accurate identification of KClO4, KNO3 and S in common inorganic explosives, whose product ion peaks were fairly adjacent to RIP. PMID:26021282

  6. Dynamics of neutralizing electrons during the focusing of intense heavy ions beams inside a HIF reactor chamber

    NASA Astrophysics Data System (ADS)

    Lifschitz, A. F.; Maynard, G.; Vay, J.-L.; Lenglet, A.

    2006-06-01

    The efficiency of a Heavy Ion Fusion reactor heavily depends on the maximum value for the density of energy (DoE) that can be deposited by the ion beams. In order to reduce the final radius, and thus to increase the DoE inside the target, the beam spatial charge has to be neutralized. Therefore the dynamics of the neutralizing electrons (DNE) play a central role in optimizing the DoE deposited in solid targets by high current of high energy heavy ion beams. We present results on some aspects of the DNE, which was performed using the Monte-Carlo 2D1/2 PIC code BPIC.

  7. Enhancement of maximum attainable ion energy in the radiation pressure acceleration regime using a guiding structure

    DOE PAGES

    Bulanov, S. S.; Esarey, E.; Schroeder, C. B.; Bulanov, S. V.; Esirkepov, T. Zh.; Kando, M.; Pegoraro, F.; Leemans, W. P.

    2015-03-13

    Radiation Pressure Acceleration is a highly efficient mechanism of laser driven ion acceleration, with the laser energy almost totally transferrable to the ions in the relativistic regime. There is a fundamental limit on the maximum attainable ion energy, which is determined by the group velocity of the laser. In the case of a tightly focused laser pulses, which are utilized to get the highest intensity, another factor limiting the maximum ion energy comes into play, the transverse expansion of the target. Transverse expansion makes the target transparent for radiation, thus reducing the effectiveness of acceleration. Utilization of an external guidingmore » structure for the accelerating laser pulse may provide a way of compensating for the group velocity and transverse expansion effects.« less

  8. Enhancement of maximum attainable ion energy in the radiation pressure acceleration regime using a guiding structure

    SciTech Connect

    Bulanov, S. S.; Esarey, E.; Schroeder, C. B.; Bulanov, S. V.; Esirkepov, T. Zh.; Kando, M.; Pegoraro, F.; Leemans, W. P.

    2015-03-13

    Radiation Pressure Acceleration is a highly efficient mechanism of laser driven ion acceleration, with the laser energy almost totally transferrable to the ions in the relativistic regime. There is a fundamental limit on the maximum attainable ion energy, which is determined by the group velocity of the laser. In the case of a tightly focused laser pulses, which are utilized to get the highest intensity, another factor limiting the maximum ion energy comes into play, the transverse expansion of the target. Transverse expansion makes the target transparent for radiation, thus reducing the effectiveness of acceleration. Utilization of an external guiding structure for the accelerating laser pulse may provide a way of compensating for the group velocity and transverse expansion effects.

  9. Recent Ion Energy Distribution Observations on MST RFP Plasmas

    NASA Astrophysics Data System (ADS)

    Clark, Jerry; Titus, J. B.; Mezonlin, E. D.; Johnson, J. A., III; Almagri, A. F.; Andeson, J. A.

    2015-11-01

    Ion energy distribution and temperature measurements have been made on the Madison Symmetric Torus (MST) using the Florida A&M University compact neutral particle analyzer (CNPA). The CNPA is a low energy (0.34-5.2 keV), high energy resolution (25 channels) neutral particle analyzer, with a radial view on MST. Recently, a retarding potential system was built to allow CNPA measurements to ensemble a complete ion energy distribution with high-energy resolution, providing insight into the dynamics of the bulk and fast ion populations. Recent work has also been done to improve the analysis techniques used to infer the ion temperature measurements, allowing us to understand temperature dynamics better during global magnetic reconnection events. Work supported in part by grants to FAMU and to UW from NSF and from Fusion Energy Sciences at DOE.

  10. Performance of solenoids versus quadrupoles in focusing and energy selection of laser accelerated protons

    NASA Astrophysics Data System (ADS)

    Hofmann, Ingo

    2013-04-01

    Using laser accelerated protons or ions for various applications—for example in particle therapy or short-pulse radiographic diagnostics—requires an effective method of focusing and energy selection. We derive an analytical scaling for the performance of a solenoid compared with a doublet/triplet as function of the energy, which is confirmed by TRACEWIN simulations. Generally speaking, the two approaches are equivalent in focusing capability, if parameters are such that the solenoid length approximately equals its diameter. The scaling also shows that this is usually not the case above a few MeV; consequently, a solenoid needs to be pulsed or superconducting, whereas the quadrupoles can remain conventional. It is also important that the transmission of the triplet is found only 25% lower than that of the equivalent solenoid. Both systems are equally suitable for energy selection based on their chromatic effect as is shown using an initial distribution following the RPA simulation model by Yan et al. [Phys. Rev. Lett. 103, 135001 (2009PRLTAO0031-900710.1103/PhysRevLett.103.135001].

  11. The 2nd Order Focusing by Energy for TOF Sector Field Mass Analyzer with an Orthogonal Acceleration: Theory, Modeling, Experiment

    NASA Astrophysics Data System (ADS)

    Poteshin, S. S.; Chernyshev, D. M.; Sysoev, Alexey A.; Sysoev, Alexander A.

    Currently axially symmetric type of analyzer with an electrostatic sector fields (AESF) is rarely used to construct time-of-flight mass spectrometers. The main drawback, hindering the wider use of the analyzers of this type, is the lack of chromatic second-order focusing by energy. However, the configuration of AESF in combination with orthogonal accelerator (OA) allows to achieved it through compensation of energy aberrations of the analyzer in the system of orthogonal input of the ion beam. In the presented work the results of theoretical calculation, simulation and experimentally obtained data are compared. Characteristics of the analyzer with OA in a large extent depend on the parameters of the incoming ion beam. Data of modeling the 2nd stage of gas-dynamic interface, which have the greatest influence on the parameters of the ion beam, is provided.

  12. Secondary batteries with multivalent ions for energy storage.

    PubMed

    Xu, Chengjun; Chen, Yanyi; Shi, Shan; Li, Jia; Kang, Feiyu; Su, Dangsheng

    2015-01-01

    The use of electricity generated from clean and renewable sources, such as water, wind, or sunlight, requires efficiently distributed electrical energy storage by high-power and high-energy secondary batteries using abundant, low-cost materials in sustainable processes. American Science Policy Reports state that the next-generation "beyond-lithium" battery chemistry is one feasible solution for such goals. Here we discover new "multivalent ion" battery chemistry beyond lithium battery chemistry. Through theoretic calculation and experiment confirmation, stable thermodynamics and fast kinetics are presented during the storage of multivalent ions (Ni(2+), Zn(2+), Mg(2+), Ca(2+), Ba(2+), or La(3+) ions) in alpha type manganese dioxide. Apart from zinc ion battery, we further use multivalent Ni(2+) ion to invent another rechargeable battery, named as nickel ion battery for the first time. The nickel ion battery generally uses an alpha type manganese dioxide cathode, an electrolyte containing Ni(2+) ions, and Ni anode. The nickel ion battery delivers a high energy density (340 Wh kg(-1), close to lithium ion batteries), fast charge ability (1 minute), and long cycle life (over 2200 times).

  13. Low energy spread ion source with a coaxial magnetic filter

    DOEpatents

    Leung, Ka-Ngo; Lee, Yung-Hee Yvette

    2000-01-01

    Multicusp ion sources are capable of producing ions with low axial energy spread which are necessary in applications such as ion projection lithography (IPL) and radioactive ion beam production. The addition of a radially extending magnetic filter consisting of a pair of permanent magnets to the multicusp source reduces the energy spread considerably due to the improvement in the uniformity of the axial plasma potential distribution in the discharge region. A coaxial multicusp ion source designed to further reduce the energy spread utilizes a cylindrical magnetic filter to achieve a more uniform axial plasma potential distribution. The coaxial magnetic filter divides the source chamber into an outer annular discharge region in which the plasma is produced and a coaxial inner ion extraction region into which the ions radially diffuse but from which ionizing electrons are excluded. The energy spread in the coaxial source has been measured to be 0.6 eV. Unlike other ion sources, the coaxial source has the capability of adjusting the radial plasma potential distribution and therefore the transverse ion temperature (or beam emittance).

  14. Energy and matter flows in a plasma focus discharge

    NASA Astrophysics Data System (ADS)

    Vikhrev, V. V.; Suslin, S. V.

    2016-01-01

    The Plasma Focus is a type of z-pinch that is widely used for both basic research and applied tasks, e.g., as materials modification or research on intense plasma flows. Although the basic mechanisms of z-pinch compression are well-known, many of the processes that occur in the plasma focus have received less attention. This article is devoted to the study of plasma jets and some of its consequences in plasma focus discharges.

  15. Focused Ion Beam (FIB) combined with SEM (FIB/SEM) and TEM: Advanced tools for nano-analysis in Geosciences

    NASA Astrophysics Data System (ADS)

    Wirth, R.; Morales, L. G.

    2011-12-01

    Focused ion beam (FIB) techniques have been successfully applied to the preparation of site-specific electron transparent membranes for transmission electron microscopy (TEM) investigations in Geosciences since several years. For example, systematic TEM studies of nano-inclusions in diamond foils prepared with FIB have improved our knowledge on diamond formation. However, FIB is not exclusively used for sample preparation for TEM application because it has been proved that one and the same TEM foil can also be used for Synchrotron IR, Synchrotron X-Ray fluorescence (XRF), scanning transmission X-Ray microscopy (STXM) and NanoSIMS analysis. In addition, FIB milling turned out to be very useful for sample preparation of Brillouin scattering experiments and has a strong potential for preparation of highly-polished, micrometer-scale samples. However, a real break through in FIB application was achieved combining a Ga-ion source of the FIB with an electron source of a scanning electron microscope (SEM) in one single instrument. The combination of FIB/SEM renders access to the third dimension of the sample possible. A cavity normal to the sample surface is sputtered with Ga-ions and this newly created inner surface is imaged with the electron beam. Alternating slicing and viewing along these cavities allow the acquisition of a sequence of images that allows the observation in 3 dimensions. Recently, this technique has been successfully applied to image the structure of grain or phase boundaries in metamorphic rocks as well as micro- and nanoporosity in shales, but its applicability goes far beyond these few examples. Combining slicing and viewing with X-Ray and electron backscatter diffraction (EBSD) analysis can provide 3D elemental mapping and 3D crystallographic orientation mapping of crystalline materials. Combined FIB/SEM devices also facilitate the preparation of substantially thinner and cleaner TEM foils (approximately 30 nm) because electron beam imaging

  16. Effect of focused ion beam deposition induced contamination on the transport properties of nano devices.

    PubMed

    Lan, Yann-Wen; Chang, Wen-Hao; Chang, Yuan-Chih; Chang, Chia-Seng; Chen, Chii-Dong

    2015-02-01

    Focused ion beam (FIB) deposition produces unwanted particle contamination beyond the deposition point. This is due to the FIB having a Gaussian distribution. This work investigates the spatial extent of this contamination and its influence on the electrical properties of nano-electronic devices. A correlation study is performed on carbon-nanotube (CNT) devices manufactured using FIB deposition. The devices are observed using transmission electron microscopy (TEM) and these images are correlated with device electrical characteristics. To discover how far Pt-nanoparticle contamination occurs along a CNT after FIB electrical contact deposition careful TEM inspections are performed. The results show FIB deposition efficiently improves electrical contact; however, the practice is accompanied by serious particle contamination near deposition points. These contaminants include metal particles and amorphous elements originating from precursor gases and residual water molecules in the vacuum chamber. Pt-contamination extends for approximately 2 μm from the point of FIB contact deposition. These contaminants cause current fluctuations and alter the transport characteristics of devices. It is recommended that nano-device fabrication occurs at a distance greater than 2 μm from the FIB deposition of an electrical contact.

  17. 3D imaging of the early embryonic chicken heart with focused ion beam scanning electron microscopy.

    PubMed

    Rennie, Monique Y; Gahan, Curran G; López, Claudia S; Thornburg, Kent L; Rugonyi, Sandra

    2014-08-01

    Early embryonic heart development is a period of dynamic growth and remodeling, with rapid changes occurring at the tissue, cell, and subcellular levels. A detailed understanding of the events that establish the components of the heart wall has been hampered by a lack of methodologies for three-dimensional (3D), high-resolution imaging. Focused ion beam scanning electron microscopy (FIB-SEM) is a novel technology for imaging 3D tissue volumes at the subcellular level. FIB-SEM alternates between imaging the block face with a scanning electron beam and milling away thin sections of tissue with a FIB, allowing for collection and analysis of 3D data. FIB-SEM was used to image the three layers of the day 4 chicken embryo heart: myocardium, cardiac jelly, and endocardium. Individual images obtained with FIB-SEM were comparable in quality and resolution to those obtained with transmission electron microscopy. Up to 1,100 serial images were obtained in 4 nm increments at 4.88 nm resolution, and image stacks were aligned to create volumes 800-1,500 μm3 in size. Segmentation of organelles revealed their organization and distinct volume fractions between cardiac wall layers. We conclude that FIB-SEM is a powerful modality for 3D subcellular imaging of the embryonic heart wall.

  18. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.

    PubMed

    Wang, Andrew; Butte, Manish J

    2014-08-01

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished. PMID:25161320

  19. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    NASA Astrophysics Data System (ADS)

    Wang, Andrew; Butte, Manish J.

    2014-08-01

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished.

  20. Large area direct-write focused ion-beam lithography with dual-beam microscope.

    SciTech Connect

    Imre-Joshi, A.; Ocola, L. E.; Rich, L.; Klingfus, J.

    2010-03-01

    The authors have investigated the performance of focused ion-beam (FIB) direct-write lithography for large area (multiple write-field) patterning in an FEI Nova Nanolab 600 dual-beam microscope. Their system is configured with a 100 nm resolution X-Y stage and a RAITH ELPHY LITHOGRAPHY control interface, with its own integrated 16 bit DAC pattern generator and software. Key issues with regard to configuration, process parameters, and procedures have been addressed. Characterization of stitching errors, pattern repeatability, and drift were performed. Offset lithography (multiple exposures with offset write fields) and in-field registration marks were evaluated for correcting stitching errors, and a test microfluidic device covering an area of 1 x 1.4 mm{sup 2} was successfully fabricated. The authors found that by using a combination of offset lithography and in-field registration mark correction methods, the stitching errors can be kept well below 100 nm. They also found that due to higher beam deflection speed provided by the electrostatic scanning in FIB systems versus the wide-spread electron-beam systems with electromagnetic scanning, FIB lithography can be just as fast as electron-beam lithography for typical mill depths down to about 200-500 nm (material dependent). This opens the door for a large suite of applications for materials where pattern transfer is difficult or impossible by reactive methods.

  1. Ultrastructural features of dentinoenamel junction revealed by focused gallium ion beam milling.

    PubMed

    Bakhsh, Turki A

    2016-10-01

    To take full advantage of focused ion beam (FIB) in preparation of ultrathin sections of biological tissues, we have used a cryo-milling process. In this study, extracted human teeth were scanned by optical coherence tomography to inspect the samples for intactness and to determine the area of interest. Then, the selected area of interest was cross-sectioned for examination under a confocal laser scanning microscope to determine the target location of the dentinoenamel junction (DEJ) that was later milled by cryo-FIB at preset parameters, followed by transmission electron microscope examination of the final sliced specimens for ultrastructural characterization. The proposed technique was able to outline the DEJ and to identify the different tooth layers in a single section, without artefacts or tissue damage. The DEJ was outlined as fine longitudinal projections intermingling between the solid electron-dense enamel and intricate electron-lucent hollow dentin. In conclusion, this study has shown the great potential of cryo-FIB in handling different biological tissues having different physical properties, with great precision and accuracy and minimum artefacts. PMID:27229629

  2. Multi-resolution correlative focused ion beam scanning electron microscopy: applications to cell biology.

    PubMed

    Narayan, Kedar; Danielson, Cindy M; Lagarec, Ken; Lowekamp, Bradley C; Coffman, Phil; Laquerre, Alexandre; Phaneuf, Michael W; Hope, Thomas J; Subramaniam, Sriram

    2014-03-01

    Efficient correlative imaging of small targets within large fields is a central problem in cell biology. Here, we demonstrate a series of technical advances in focused ion beam scanning electron microscopy (FIB-SEM) to address this issue. We report increases in the speed, robustness and automation of the process, and achieve consistent z slice thickness of ∼3 nm. We introduce "keyframe imaging" as a new approach to simultaneously image large fields of view and obtain high-resolution 3D images of targeted sub-volumes. We demonstrate application of these advances to image post-fusion cytoplasmic intermediates of the HIV core. Using fluorescently labeled cell membranes, proteins and HIV cores, we first produce a "target map" of an HIV infected cell by fluorescence microscopy. We then generate a correlated 3D EM volume of the entire cell as well as high-resolution 3D images of individual HIV cores, achieving correlative imaging across a volume scale of 10(9) in a single automated experimental run.

  3. Focused ion beam processing to fabricate ohmic contact electrodes on a bismuth nanowire for Hall measurements

    PubMed Central

    2013-01-01

    Ohmic contact electrodes for four-wire resistance and Hall measurements were fabricated on an individual single-crystal bismuth nanowire encapsulated in a cylindrical quartz template. Focused ion beam processing was utilized to expose the side surfaces of the bismuth nanowire in the template, and carbon and tungsten electrodes were deposited on the bismuth nanowire in situ to achieve electrical contacts. The temperature dependence of the four-wire resistance was successfully measured for the bismuth nanowire, and a difference between the resistivities of the two-wire and four-wire methods was observed. It was concluded that the two-wire method was unsuitable for estimation of the resistivity due to the influence of contact resistance, even if the magnitude of the bismuth nanowire resistance was greater than the kilo-ohm order. Furthermore, Hall measurement of a 4-μm-diameter bismuth microwire was also performed as a trial, and the evaluated temperature dependence of the carrier mobility was in agreement with that for bulk bismuth, which indicates that the carrier mobility was successfully measured using this technique. PACS 81.07.Gf PMID:24070421

  4. Anchoring structure of the calvarial periosteum revealed by focused ion beam/scanning electron microscope tomography

    PubMed Central

    Hirashima, Shingo; Ohta, Keisuke; Kanazawa, Tomonoshin; Uemura, Kei-ichiro; Togo, Akinobu; Yoshitomi, Munetake; Okayama, Satoko; Kusukawa, Jingo; Nakamura, Kei-ichiro

    2015-01-01

    An important consideration in regeneration therapy is the fact that the tissue surrounding an organ supports its function. Understanding the structure of the periosteum can contribute to more effective bone regeneration therapy. As a cellular source, the periosteum also assists bone growth and fracture healing; this further necessitates its direct contact with the bone. However, its anchoring strength appears to be inexplicably stronger than expected. In this study, we used focused ion beam/scanning electron microscope tomography to investigate ultrathin serial sections as well as the three dimensional ultrastructure of the periosteum to clarify the architecture of its anchoring strength, as such assessments are challenging using conventional methods. We discovered perforating fibres that arise from the bone surface at 30 degree angles. Additionally, the fibres across the osteoblast layer were frequently interconnected to form a net-like structure. Fibroblast processes were observed extending into the perforating fibres; their morphologies were distinct from those of typical fibroblasts. Thus, our study revealed novel ultrastructures of the periosteum that support anchorage and serve as a cellular source as well as a mechanical stress transmitter. PMID:26627533

  5. Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer

    SciTech Connect

    Wang, Andrew; Butte, Manish J.

    2014-08-04

    We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy for certain tip geometries that cannot be achieved by conventional lithography. For example, in probing complex layered materials or tall biological cells using AFM, a tall tip with a high-aspect-ratio is required to avoid artifacts caused by collisions of the tip's sides with the material being probed. We show experimentally that tall (18 μm) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in an increased quality factor (Q) of the fundamental flexural mode. We demonstrate that a customized tip's well-defined geometry, tall tip height, and aspect ratio enable improved measurement of elastic moduli by allowing access to low-laying portions of tall cells (T lymphocytes). This technique can be generally used to attach tips to any micromechanical device when conventional lithography of tips cannot be accomplished.

  6. Site-Specific Cryo-focused Ion Beam Sample Preparation Guided by 3D Correlative Microscopy.

    PubMed

    Arnold, Jan; Mahamid, Julia; Lucic, Vladan; de Marco, Alex; Fernandez, Jose-Jesus; Laugks, Tim; Mayer, Tobias; Hyman, Anthony A; Baumeister, Wolfgang; Plitzko, Jürgen M

    2016-02-23

    The development of cryo-focused ion beam (cryo-FIB) for the thinning of frozen-hydrated biological specimens enabled cryo-electron tomography (cryo-ET) analysis in unperturbed cells and tissues. However, the volume represented within a typical FIB lamella constitutes a small fraction of the biological specimen. Retaining low-abundance and dynamic subcellular structures or macromolecular assemblies within such limited volumes requires precise targeting of the FIB milling process. In this study, we present the development of a cryo-stage allowing for spinning-disk confocal light microscopy at cryogenic temperatures and describe the incorporation of the new hardware into existing workflows for cellular sample preparation by cryo-FIB. Introduction of fiducial markers and subsequent computation of three-dimensional coordinate transformations provide correlation between light microscopy and scanning electron microscopy/FIB. The correlative approach is employed to guide the FIB milling process of vitrified cellular samples and to capture specific structures, namely fluorescently labeled lipid droplets, in lamellas that are 300 nm thick. The correlation procedure is then applied to localize the fluorescently labeled structures in the transmission electron microscopy image of the lamella. This approach can be employed to navigate the acquisition of cryo-ET data within FIB-lamellas at specific locations, unambiguously identified by fluorescence microscopy.

  7. Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy

    PubMed Central

    Chen, Ran; Hu, Keke; Yu, Yun; Mirkin, Michael V.; Amemiya, Shigeru

    2016-01-01

    Nanoscale scanning electrochemical microscopy (SECM) has emerged as a powerful electrochemical method that enables the study of interfacial reactions with unprecedentedly high spatial and kinetic resolution. In this work, we develop carbon nanoprobes with high electrochemical reactivity and well-controlled size and geometry based on chemical vapor deposition of carbon in quartz nanopipets. Carbon-filled nanopipets are milled by focused ion beam (FIB) technology to yield a flat disk tip with a thin quartz sheath as confirmed by transmission electron microscopy. The extremely high electroactivity of FIB-milled carbon nanotips is quantified by enormously high standard electron-transfer rate constants of ≥10 cm/s for Ru(NH3)63+. The tip size and geometry are characterized in electrolyte solutions by SECM approach curve measurements not only to determine inner and outer tip radii of down to ~27 and ~38 nm, respectively, but also to ensure the absence of a conductive carbon layer on the outer wall. In addition, FIB-milled carbon nanotips reveal the limited conductivity of ~100 nm-thick gold films under nanoscale mass-transport conditions. Importantly, carbon nanotips must be protected from electrostatic damage to enable reliable and quantitative nanoelectrochemical measurements. PMID:27642187

  8. Ultrastructural features of dentinoenamel junction revealed by focused gallium ion beam milling.

    PubMed

    Bakhsh, Turki A

    2016-10-01

    To take full advantage of focused ion beam (FIB) in preparation of ultrathin sections of biological tissues, we have used a cryo-milling process. In this study, extracted human teeth were scanned by optical coherence tomography to inspect the samples for intactness and to determine the area of interest. Then, the selected area of interest was cross-sectioned for examination under a confocal laser scanning microscope to determine the target location of the dentinoenamel junction (DEJ) that was later milled by cryo-FIB at preset parameters, followed by transmission electron microscope examination of the final sliced specimens for ultrastructural characterization. The proposed technique was able to outline the DEJ and to identify the different tooth layers in a single section, without artefacts or tissue damage. The DEJ was outlined as fine longitudinal projections intermingling between the solid electron-dense enamel and intricate electron-lucent hollow dentin. In conclusion, this study has shown the great potential of cryo-FIB in handling different biological tissues having different physical properties, with great precision and accuracy and minimum artefacts.

  9. Lateral straggle of Si and Be focused-ion beam implanted in GaAs

    SciTech Connect

    Vignaud, D.; Musil, C.R.; Etchin, S.

    1993-05-01

    The lateral distribution of focused-ion-beam implanted Si and Be atoms has been studied by measuring the electrical resistivity in grating structures. The gratings which were oriented perpendicular to the direction of the current flow were implanted with silicon and beryllium at 280 and 260 keV, respectively. They were implanted into semi-insulating materials cut on and off axis, and then rapid thermal annealed. The lateral straggle was found to be less than 100 nm for Si and equal to 190 nm for the Be implants. The standard deviation of the lateral distribution was found to increase with the dose. This is attributed to a concentration-dependent diffusion which results in an anomalously high diffusion coefficient. Comparison of the experimental parameters of the implanted distribution with values found in standard tables or calculated by a Monte Carlo TRIM code seems to indicate that all simulations overestimate the lateral straggle at the expense of the penetration depth. 27 refs., 5 figs., 3 tabs.

  10. Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy

    PubMed Central

    Chen, Ran; Hu, Keke; Yu, Yun; Mirkin, Michael V.; Amemiya, Shigeru

    2016-01-01

    Nanoscale scanning electrochemical microscopy (SECM) has emerged as a powerful electrochemical method that enables the study of interfacial reactions with unprecedentedly high spatial and kinetic resolution. In this work, we develop carbon nanoprobes with high electrochemical reactivity and well-controlled size and geometry based on chemical vapor deposition of carbon in quartz nanopipets. Carbon-filled nanopipets are milled by focused ion beam (FIB) technology to yield a flat disk tip with a thin quartz sheath as confirmed by transmission electron microscopy. The extremely high electroactivity of FIB-milled carbon nanotips is quantified by enormously high standard electron-transfer rate constants of ≥10 cm/s for Ru(NH3)63+. The tip size and geometry are characterized in electrolyte solutions by SECM approach curve measurements not only to determine inner and outer tip radii of down to ~27 and ~38 nm, respectively, but also to ensure the absence of a conductive carbon layer on the outer wall. In addition, FIB-milled carbon nanotips reveal the limited conductivity of ~100 nm-thick gold films under nanoscale mass-transport conditions. Importantly, carbon nanotips must be protected from electrostatic damage to enable reliable and quantitative nanoelectrochemical measurements.

  11. Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam.

    PubMed

    Inkson, B J; Dehm, G; Wagner, T

    2004-06-01

    Ti and Pt nanowires have been produced by ultra high-vacuum molecular beam epitaxy deposition of Ti thin films and focused ion beam (FIB) deposition of Pt thin films, followed by cross-sectional FIB sputtering to form electron-transparent nanowires. The thermal stability of the nanowires has been investigated by in situ thermal cycling in a transmission electron microscope. Epitaxial single crystal Ti nanowires on (0001)Al(2)O(3) substrates are microstructurally stable up to 550-600 degrees C, above which limited dislocation motion is activated shortly before the Ti-wires oxidize. The amorphous FIB-deposited Pt wires are stable up to 580-650 degrees C where partial crystallization is observed in vacuum. Faceted nanoparticles grow on the wire surface, growing into free space by surface diffusion and minimizing contact area with the underlying wire. The particles are face-centred cubic (fcc) Pt with some dissolved Ga. Continued heating results in particle spheroidization, coalescence and growth, retaining the fcc structure.

  12. Chemotrophic filamentous microfossils from the Hollard Mound (Devonian, Morocco) as investigated by focused ion beam.

    PubMed

    Cavalazzi, Barbara

    2007-04-01

    The biologic origin of objects with microbe-like morphologies from the oldest preserved terrestrial sedimentary rocks remains a matter of controversy. Their biogenicity has been questioned, as well as the claim that they are convincing evidence of early life. Though minerals with microbe-like morphologies represent ambiguous evidence of life, they are, in a number of conditions, the only achievable information. In this study, the focused ion beam (FIB) electron microscopy technique was used for nano and micrometer-scale high-resolution imaging and in situ microsectioning of filamentous microfossils. The structural elements of these filaments, their spatial relationships with the host rock, and artifacts produced by alteration of the original morphology due to laboratory sample processing have been clearly defined. The in situ sectioning provided a means by which to investigate surface and subsurface microstructures and perform different analytical techniques on the same object, which minimizes sample destruction and avoids excessive manual handling and exposure of the specimen during analysis. Improvement in the morphological and compositional evaluation of the filaments has facilitated the development of a hypothesis regarding the metabolic pathway of the filamentous microfossils preserved in the Middle Devonian-aged Hollard Mound deposit, Anti-Atlas, Morocco. The results of this study demonstrate the potential of the FIB/SEM (scanning electron microscopy) system for detecting microbial-scale morphologies.

  13. Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam.

    PubMed

    Alaie, Seyedhamidreza; Goettler, Drew F; Jiang, Ying-Bing; Abbas, Khawar; Baboly, Mohammadhosein Ghasemi; Anjum, D H; Chaieb, S; Leseman, Zayd C

    2015-02-27

    Pt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m(-1) K(-1) versus 71.6 W m(-1) K(-1) at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB. PMID:25649468

  14. Creation of damage-free ferroelectric nanostructures via focused ion beam milling.

    PubMed

    Hambe, M; Wicks, S; Gregg, J M; Nagarajan, V

    2008-04-30

    We present a novel method for creating damage-free ferroelectric nanostructures with a focused ion beam milling machine. Using a standard e-beam photoresist followed by a dilute acid wash, nanostructures ranging in size from 1 µm down to 250 nm were created in a 90 nm thick lead zirconate titanate (PZT) wafer. Transmission electron microscopy and piezoresponse force microscopy (PFM) confirmed that the surfaces of the nanostructures remained damage free during fabrication, and showed no gallium implantation, and that there was no degradation of ferroelectric properties. In fact DC strain loops, obtained using PFM, demonstrated that the nanostructures have a higher piezoresponse than unmilled films. As the samples did not have any top hard mask, the method presented is unique as it allows for imaging of the top surface to understand edge effects in well-defined nanostructures. In addition, as no post-mill annealing was necessary, it facilitates investigation of nanoscale domain mechanisms without process-induced artefacts.

  15. Production of low axial energy spread ion beams with multicusp sources

    SciTech Connect

    Lee, Y.H.Y.

    1998-05-01

    Multicusp ion sources are capable of producing ions with low axial energy spread which are necessary in applications such as: ion projection lithography (IPL) and focused ion beams for the next generation lithographic tools and nuclear science experiments such as radioactive ion beam production. The axial ion energy spread for multicusp source is approximately 6 eV which is too large for IPL and radioactive ion beam applications. The addition of a magnetic filter which consists of a pair of permanent magnets to the multicusp source reduces the energy spread considerably. The reduction is due to the improvement in the uniformity of the axial plasma potential distribution in the discharge region. Axial ion energy spread of the filament driven ion source has been measured using three different techniques. In all cases, it was found to be less than 2 eV. Energy spread of the radio frequency (RF) driven source has also been explored, and it was found to be less than 3 eV with the proper RF-shielding. A new multicusp source configuration has been designed and constructed to further reduce the energy spread. To achieve a more uniform axial plasma potential distribution, a cylindrical magnetic filter has been designed and constructed for a 2-cm-diameter source. This new source configuration, the co-axial source, is new in its kind. The energy spread in this source has been measured to be a record low of 0.6 eV. Because of the novelty of this device, some plasma parameters inside the source have been studied. Langmuir probe has been used to measure the plasma potential, the electron temperature and the density distribution.

  16. How Constant Momentum Acceleration Decouples Energy and Space Focusing in Distance-of-Flight and Time-of-Flight Mass Spectrometries

    SciTech Connect

    Dennis, Elise; Gundlach-Graham, Alexander W.; Enke, Chris; Ray, Steven J.; Carado, Anthony J.; Barinaga, Charles J.; Koppenaal, David W.; Hieftje, Gary M.

    2013-05-01

    Time-of-flight (TOF) and distance-of-flight (DOF) mass spectrometers require means for focusing ions at the detector(s) because of initial dispersions of position and energy at the time of their acceleration. Time-of-flight mass spectrometers ordinarily employ constant energy acceleration (CEA), which creates a space-focus plane at which the initial spatial dispersion is corrected. In contrast, constant-momentum acceleration (CMA), in conjunction with an ion mirror, provides focus of the initial energy dispersion at the energy focus time for ions of all m/z at their respective positions along the flight path. With CEA, the initial energy dispersion is not simultaneously correctable as its effect on ion velocity is convoluted with that of the spatial dispersion. The initial spatial dispersion with CMA remains unchanged throughout the field-free region of the flight path, so spatial dispersion can be reduced before acceleration. Improved focus is possible when each dispersion can be addressed independently. With minor modification, a TOF mass spectrometer can be operated in CMA mode by treating the TOF detector as though it were a single element in the array of detectors that would be used in a DOF mass spectrometer. Significant improvement in mass resolution is thereby achieved, albeit over a narrow range of m/z values. In this paper, experimental and theoretical results are presented that illustrate the energy-focusing capabilities of both DOF and TOF mass spectrometry.

  17. Implementing energy education focusing on attitudes and concerns

    SciTech Connect

    Ulmer, D.C. Jr.

    1983-01-01

    Forty-two secondary science and social studies teachers from 11 high schools in Lincoln and Omaha, Nebraska administered the Youth Energy Survey (Michigan Energy Extension Service) to their classes (N = 3129), received survey results and interpretive data, and were invited to request innovative energy-education materials from the Nebraska State Energy Office. All teachers completed a modified form of the Youth Energy Survey (Adult Energy Survey) and the Stages of Concern Questionnaire. (1) Comparison of 1981 student energy attitude scores with 1979 scores showed more positive scores on five scales, more negative scores for one scale (nuclear energy), and no change on three scales. (2) With no exceptions, mean teacher attitude scores were more positive than were student attitude scores. Teachers classified in the impact concern stage had consistently more positive attitude scores than did teachers in either the self or task concern groups. (3) There appears to be little or no relationship between teacher and student energy attitudes. (4) Teachers with impact concerns about energy education had the most negative energy attitudes. (5) The ratio of request/no request responses for energy-education materials was uniformly consistent across all teacher concern states. Three out of four teachers in the study requested no energy-education materials. (6) Teacher search behavior for alternatives to existing curriculum materials was significantly increased when the Youth Energy Survey was administered to classes and the results of the survey returned to teachers.

  18. Investigation of Generation, Acceleration, Transport and Final Focusing of High-Intensity Heavy Ion Beams from Sources to Targets

    SciTech Connect

    Chiping Chen

    2006-10-26

    Under the auspices of the research grant, the Intense Beam Theoretical Research Goup at Massachusetts Institute of Technology's Plasma Science and Fusion Center made significant contributions in a number of important areas in the HIF and HEDP research, including: (a) Derivation of rms envelope equations and study of rms envelope dynamics for high-intensity heavy ion beams in a small-aperture AG focusing transport systems; (b) Identification of a new mechanism for chaotic particle motion, halo formation, and beam loss in high-intensity heavy ion beams in a small-aperture AG focusing systems; Development of elliptic beam theory; (d) Study of Physics Issues in the Neutralization Transport Experiment (NTX).

  19. Energy-Based Adaptive Focusing: Optimal Ultrasonic Focusing Using Magnetic Resonance Guidance

    NASA Astrophysics Data System (ADS)

    Larrat, B.; Pernot, M.; Montaldo, G.; Fink, M.; Tanter, M.

    2010-03-01

    Adaptive focusing of ultrasonic waves is performed under the guidance of a Magnetic Resonance (MR) system. The technique is based on the maximization of the ultrasonic wave intensity at a target point. The wave intensity is indirectly estimated from the local tissue motion induced at the chosen focus by the acoustic radiation force of the ultrasonic beam. A motion sensitive MR sequence is used to measure the resulting local tissue displacements. Based on the transmission of a set of spatially coded ultrasonic waves, a non iterative inversion process is used to estimate the phase aberrations induced by the propagation medium and to maximize the acoustical intensity at the target. Both programmable and physical aberrating layers introducing strong distortions (up to 2π radians) are recovered within acceptable errors (<0.8 rad). This non invasive technique is shown to accurately correct the phase aberrations in a phantom gel with negligible heat deposition and limited acquisition time. These refocusing performances demonstrate a major potential in the field of MR-Guided Ultrasound Therapy in particular for transcranial brain HIFU.

  20. High-energy ion tracks in thin films.

    SciTech Connect

    Doyle, Barney Lee; Follstaedt, David Martin; McDaniel, Floyd Del; Rossi, Paolo; Norman, Adam K.; Bringa, Eduardo M

    2004-08-01

    High-energy ion tracks (374 MeV Au{sup 26+}) in thin films were examined with transmission electron microscopy to investigate nanopore formation. Tracks in quartz and mica showed diffraction contrast. Tracks in sapphire and mica showed craters formed at the positions of ion incidence and exit, with a lower-density track connecting them. Direct nanopore formation by ions (without chemical etching) would appear to require film thicknesses less than 10 nm.

  1. Energy distributions of sputtered copper neutrals and ions

    NASA Technical Reports Server (NTRS)

    Lundquist, T. R.

    1978-01-01

    Direct quantitative analysis of surfaces by secondary ion mass spectrometry will depend on an understanding of the yield ratio of ions to neutrals. This ratio as a function of the energy of the sputtered particles has been obtained for a clean polycrystalline copper surface sputtered by 1000-3000 eV Ar(+). The energy distributions of both neutral and ionized copper were measured with a retarding potential analyzer using potential modulation differentiation and signal averaging. The maximum for both distributions is identical and occurs near 2.5 eV. The energy distributions of neutrals is more sharply peaked than that of the ions, presumably as a consequence of more efficient nutralization of slow escaping ions by the mobile electrons of copper. The ion-neutral ratio is compared with results from various ionization models.

  2. Focus On: Classroom Energy Materials. Publication Number 11895.

    ERIC Educational Resources Information Center

    Kocsis, Mitzie

    The Massachusetts Dissemination Project presents this compendium of energy-related educational resources as a reference guide for persons interested in exploring energy problems, conservation techniques, and alternate energy sources with their students. Provided are brief descriptions of available bibliographies, classroom materials, publications,…

  3. Secondary batteries with multivalent ions for energy storage

    NASA Astrophysics Data System (ADS)

    Xu, Chengjun; Chen, Yanyi; Shi, Shan; Li, Jia; Kang, Feiyu; Su, Dangsheng

    2015-09-01

    The use of electricity generated from clean and renewable sources, such as water, wind, or sunlight, requires efficiently distributed electrical energy storage by high-power and high-energy secondary batteries using abundant, low-cost materials in sustainable processes. American Science Policy Reports state that the next-generation “beyond-lithium” battery chemistry is one feasible solution for such goals. Here we discover new “multivalent ion” battery chemistry beyond lithium battery chemistry. Through theoretic calculation and experiment confirmation, stable thermodynamics and fast kinetics are presented during the storage of multivalent ions (Ni2+, Zn2+, Mg2+, Ca2+, Ba2+, or La3+ ions) in alpha type manganese dioxide. Apart from zinc ion battery, we further use multivalent Ni2+ ion to invent another rechargeable battery, named as nickel ion battery for the first time. The nickel ion battery generally uses an alpha type manganese dioxide cathode, an electrolyte containing Ni2+ ions, and Ni anode. The nickel ion battery delivers a high energy density (340 Wh kg-1, close to lithium ion batteries), fast charge ability (1 minute), and long cycle life (over 2200 times).

  4. Secondary batteries with multivalent ions for energy storage

    PubMed Central

    Xu, Chengjun; Chen, Yanyi; Shi, Shan; Li, Jia; Kang, Feiyu; Su, Dangsheng

    2015-01-01

    The use of electricity generated from clean and renewable sources, such as water, wind, or sunlight, requires efficiently distributed electrical energy storage by high-power and high-energy secondary batteries using abundant, low-cost materials in sustainable processes. American Science Policy Reports state that the next-generation “beyond-lithium” battery chemistry is one feasible solution for such goals. Here we discover new “multivalent ion” battery chemistry beyond lithium battery chemistry. Through theoretic calculation and experiment confirmation, stable thermodynamics and fast kinetics are presented during the storage of multivalent ions (Ni2+, Zn2+, Mg2+, Ca2+, Ba2+, or La3+ ions) in alpha type manganese dioxide. Apart from zinc ion battery, we further use multivalent Ni2+ ion to invent another rechargeable battery, named as nickel ion battery for the first time. The nickel ion battery generally uses an alpha type manganese dioxide cathode, an electrolyte containing Ni2+ ions, and Ni anode. The nickel ion battery delivers a high energy density (340 Wh kg−1, close to lithium ion batteries), fast charge ability (1 minute), and long cycle life (over 2200 times). PMID:26365600

  5. Ion energy measurements near a dormant cathode in a multiple-cathode gridded ion thruster

    SciTech Connect

    Rovey, Joshua L.; Gallimore, Alec D.

    2007-03-15

    A rectangular ion thruster discharge chamber was investigated for operation with multiple discharge cathode assemblies (DCAs). The multiple cathode approach attempts to increase thruster throughput and lifetime by operating three DCAs sequentially, possibly providing a threefold increase in discharge life. Previous multiple-cathode electric propulsion devices, such as the SPT-100, have shown dormant cathode erosion to be a life-limiting phenomenon. Similar results in a multiple-cathode discharge chamber may decrease the anticipated gain in discharge lifetime. In order to assess possible dormant cathode sputtering erosion, a diagnostic canister (DC) was designed and utilized to measure bombarding ion energy at the dormant cathode locations. The DC appeared similar to the active DCA, but was outfitted with a retarding potential analyzer. Most probable ion energy measurements show ions with energy of 27-35 eV ({+-}10%) with respect to cathode common and ion energy increases with increasing magnetic field strength. These results are consistent with an ion falling from the plasma potential to cathode common. A simple sputtering erosion model shows that, if doubly charged ions are present, these energies are enough to cause sputtering erosion of the dormant units.

  6. Silica-gold bilayer-based transfer of focused ion beam-fabricated nanostructures

    NASA Astrophysics Data System (ADS)

    Wu, Xiaofei; Geisler, Peter; Krauss, Enno; Kullock, René; Hecht, Bert

    2015-10-01

    The demand for using nanostructures fabricated by focused ion beam (FIB) on delicate substrates or as building blocks for complex devices motivates the development of protocols that allow FIB-fabricated nanostructures to be transferred from the original substrate to the desired target. However, transfer of FIB-fabricated nanostructures is severely hindered by FIB-induced welding of structure and substrate. Here we present two (ex and in situ) transfer methods for FIB-fabricated nanostructures based on a silica-gold bilayer evaporated onto a bulk substrate. Utilizing the poor adhesion between silica and gold, the nanostructures can be mechanically separated from the bulk substrate. For the ex situ transfer, a spin-coated poly(methyl methacrylate) film is used to carry the nanostructures so that the bilayer can be etched away after being peeled off. For the in situ transfer, using a micro-manipulator inside the FIB machine, a cut-out piece of silica on which a nanostructure has been fabricated is peeled off from the bulk substrate and thus carries the nanostructure to a target substrate. We demonstrate the performance of both methods by transferring plasmonic nano-antennas fabricated from single-crystalline gold flakes by FIB milling to a silicon wafer and to a scanning probe tip.The demand for using nanostructures fabricated by focused ion beam (FIB) on delicate substrates or as building blocks for complex devices motivates the development of protocols that allow FIB-fabricated nanostructures to be transferred from the original substrate to the desired target. However, transfer of FIB-fabricated nanostructures is severely hindered by FIB-induced welding of structure and substrate. Here we present two (ex and in situ) transfer methods for FIB-fabricated nanostructures based on a silica-gold bilayer evaporated onto a bulk substrate. Utilizing the poor adhesion between silica and gold, the nanostructures can be mechanically separated from the bulk substrate. For the ex

  7. Glass nanoimprint using amorphous Ni-P mold etched by focused-ion beam

    SciTech Connect

    Mekaru, Harutaka; Kitadani, Takeshi; Yamashita, Michiru; Takahashi, Masaharu

    2007-07-15

    The authors succeeded in glass-nanoimprint lithography of micropatterns and nanopatterns using an amorphous Ni-P alloy mold. Glasslike carbon has been used as a mold material to mold not only Pyrex glass but also quartz, because it is still stable at a temperature of 1650 deg. C. However, it is difficult to process glasslike carbon substrates into arbitrary shapes by machining. They thought that amorphous Ni-P alloy could be used as a mold material for industrial glass molding. If Ni is electroless plated when mixed with suitable amount of P on a Si wafer, the Ni-P alloy layer becomes amorphous. An appropriate ratio of Ni and P was determined by the results of x-ray-diffraction measurements. The optimized composition ratio of Ni-P was Ni:P=92:8 wt %. Moreover, line and space patterns and dot arrays with linewidths of as little as 500 nm were etched on the mold using focused-ion beam (FIB) and the processing accuracy for the amorphous Ni-P layer was compared with that for the pure Ni layer. The result was that patterns of 500 nm width were etched to a depth of 2 {mu}m on an amorphous Ni-P alloy mold and the processed surfaces were smooth. In contrast, in the case of the pure Ni layer, the processing line was notched and the sidewalls were very rough. The crystal grain seems to hinder the processing of the nanopattern. After FIB etching, the amorphous Ni-P alloy was thermally treated at 400 deg. C to improve the hardness. Finally, line and space patterns and dot arrays on the amorphous Ni-P alloy mold were nanoimprinted on Pyrex glass using a glass-nanoimprint system (ASHE0201) that National Institute of Advanced Industrial Science and Technology developed.

  8. Patterning of Spiral Structure on Optical Fiber by Focused-Ion-Beam Etching

    NASA Astrophysics Data System (ADS)

    Mekaru, Harutaka; Yano, Takayuki

    2012-06-01

    We produce patterns on minute and curved surfaces of optical fibers, and develop a processing technology for fabricating sensors, antennas, electrical circuits, and other devices on such patterned surfaces by metallization. A three-dimensional processing technology can be used to fabricate a spiral coil on the surface of cylindrical quartz materials, and then the microcoils can also be applied to capillaries of micro-fluid devices, as well as to receiver coils connected to a catheter and an endoscope of nuclear magnetic resonance imaging (MRI) systems used in imaging blood vessels. To create a spiral line pattern with a small linewidth on a full-circumference surface of an optical fiber, focused-ion-beam (FIB) etching was employed. Here, a simple rotation stage comprising a dc motor and an LR3 battery was built. However, during the development of a prototype rotation stage before finalizing a large-scale remodelling of our FIB etching system, a technical problem was encountered where a spiral line could not be processed without running into breaks and notches in the features. It turned out that the problem was caused by axis blur resulting from an eccentric spinning (or wobbling) of the axis of the fiber caused by its unrestrained free end. The problem was solved by installing a rotation guide and an axis suppression device onto the rotation stage. Using this improved rotation stage. we succeeded in the seamless patterning of 1-µm-wide features on the full-circumference surface of a 250-µm-diameter quartz optical fiber (QOF) by FIB etching.

  9. Drift Compression and Final Focus for Intense Heavy Ion Beams with Non-periodic, Time-dependent Lattice

    SciTech Connect

    Hong Qin; Ronald C. Davidson; John J. Barnard; Edward P. Lee

    2005-02-14

    In the currently envisioned configurations for heavy ion fusion, it is necessary to longitudinally compress the beam bunches by a large factor after the acceleration phase. Because the space-charge force increases as the beam is compressed, the beam size in the transverse direction will increase in a periodic quadrupole lattice. If an active control of the beam size is desired, a larger focusing force is needed to confine the beam in the transverse direction, and a non-periodic quadrupole lattice along the beam path is necessary. In this paper, we describe the design of such a focusing lattice using the transverse envelope equations. A drift compression and final focus lattice should focus the entire beam pulse onto the same focal spot on the target. This is difficult with a fixed lattice, because different slices of the beam may have different perveance and emittance. Four time-dependent magnets are introduced in the upstream of drift compression to focus the entire pulse onto the sam e focal spot. Drift compression and final focusing schemes are developed for a typical heavy ion fusion driver and for the Integrated Beam Experiment (IBX) being designed by the Heavy Ion Fusion Virtual National Laboratory.

  10. ESR studies on pet irradiated with high energy ions

    NASA Astrophysics Data System (ADS)

    Chipară, Mircea Ioan; Bunget, Ion; Georgescu, Rodica; Georgescu, Edith; Vîlcov, Isabela

    1983-05-01

    Electron spin resonance studies on polyethylene terephtalate films, irradiated with high energy oxygen and sulphur ions are reported. The dependence of the resonance line parameters on time, temperature and on UV postirradiation time is investigated.

  11. IONS (ANURADHA): Ionization states of low energy cosmic rays

    NASA Technical Reports Server (NTRS)

    Biswas, S.; Chakraborti, R.; Cowsik, R.; Durgaprasad, N.; Kajarekar, P. J.; Singh, R. K.; Vahia, M. N.; Yadav, J. S.; Dutt, N.; Goswami, J. N.

    1987-01-01

    IONS (ANURADHA), the experimental payload designed specifically to determine the ionization states, flux, composition, energy spectra and arrival directions of low energy (10 to 100 MeV/amu) anomalous cosmic ray ions of helium to iron in near-Earth space, had a highly successful flight and operation Spacelab-3 mission. The experiment combines the accuracy of a highly sensitive CR-39 nuclear track detector with active components included in the payload to achieve the experimental objectives. Post-flight analysis of detector calibration pieces placed within the payload indicated no measurable changes in detector response due to its exposure in spacelab environment. Nuclear tracks produced by alpha-particles, oxygen group and Fe ions in low energy anomalous cosmic rays were identified. It is calculated that the main detector has recorded high quality events of about 10,000 alpha-particles and similar number of oxygen group and heavier ions of low energy cosmic rays.

  12. Focused ion beam patterned Fe thin films A study by selective area Stokes polarimetry and soft x-Ray microscopy

    SciTech Connect

    Cook, P. J.; Shen, T. H.; Grundy, P. J.; Im, M.-Y.; Fischer, P.; Morton, S. A.; Kilcoyne, A. L. D.

    2010-11-14

    We demonstrate the potential to modify the magnetic behavior and structural properties of ferromagnetic thin films using focused ion beam 'direct-write' lithography. Patterns inspired by the split-ring resonators often used as components in meta-materials were defined upon 15 nm Fe films using a 30 keV Ga{sup +} focused ion beam at a dose of 2 x 10{sup 16} ions cm{sup -2}. Structural, chemical and magnetic changes to the Fe were studied using transmission soft X-ray microscopy at the ALS, Berkeley CA. X-ray absorption spectra showed a 23% reduction in the thickness of the film in the Ga irradiated areas, but no chemical change to the Fe was evident. X-ray images of the magnetic reversal process show domain wall pinning around the implanted areas, resulting in an overall increase in the coercivity of the film. Transmission electron microscopy showed significant grain growth in the implanted regions.

  13. Micro/nanofabrication of poly({sub L}-lactic acid) using focused ion beam direct etching

    SciTech Connect

    Oyama, Tomoko Gowa; Nagasawa, Naotsugu; Taguchi, Mitsumasa; Hinata, Toru; Washio, Masakazu; Oshima, Akihiro; Tagawa, Seiichi

    2013-10-14

    Micro/nanofabrication of biocompatible and biodegradable poly({sub L}-lactic acid) (PLLA) using focused Ga ion beam direct etching was evaluated for future bio-device applications. The fabrication performance was determined with different ion fluences and fluxes (beam currents), and it was found that the etching speed and fabrication accuracy were affected by irradiation-induced heat. Focused ion beam (FIB)-irradiated surfaces were analyzed using micro-area X-ray photoelectron spectroscopy. Owing to reactions such as the physical sputtering of atoms and radiation-induced decomposition, PLLA was gradually carbonized with increasing C=C bonds. Controlled micro/nanostructures of PLLA were fabricated with C=C bond-rich surfaces expected to have good cell attachment properties.

  14. Analytic model of ion emission from the focus of an intense relativistic electron beam on a target

    SciTech Connect

    Caporaso, G J; Chen, Y J

    1998-08-23

    Advanced radiographic systems for stockpile stewardship require very small x-ray sources to achieve the required resolution. Focusing multi-kiloampere beams to diameters on the order of 1 mm onto a Bremsstrahlung target leads to the generation of axial electric fields on the order of several MV/cm which act to extract ions out of the surface plasma and accelerate them upstream into the beam. These backstreaming ions act as a distributed electrostatic lens which can perturb the focus of the electron beam in a time varying manner during the pulse. An analytic model of the ion extraction is presented for a particular target geometry along with scaling laws for the perturbation of the focal spot.

  15. Low-energy ion-molecule reaction dynamics and chemiionization kinetics

    NASA Astrophysics Data System (ADS)

    Farrar, J. M.

    1981-07-01

    Experiments in photodissociation of organic cations to study the competition between isomerization and fragmentation and low energy proton transfer reactions of HCO(+) with selected neutrals are described. The former area provides a sideline to combustion studies of proton transfer in hydrocarbon flames, but the question of energy transfer in highly excited gas phase ion impacts directly upon questions closely related to the fate of ions in combustion. The latter area, currently in progress, focuses upon the dynamics of biomolecular reactions of direct relevance to combustion.

  16. Energy loss of ions implanted in MOS dielectric films

    NASA Astrophysics Data System (ADS)

    Shyam, Radhey

    Energy loss measurements of ions in the low kinetic energy regime have been made on as-grown SiO2(170-190nm) targets. Singly charged Na + ions with kinetic energies of 2-5 keV and highly charged ions Ar +Q (Q=4, 8 and 11) with a kinetic energy of 1 keV were used. Excitations produced by the ion energy loss in the oxides were captured by encapsulating the irradiated oxide under a top metallic contact. The resulting Metal-Oxide-Semiconductor (MOS) devices were probed with Capacitance-Voltage (C V) measurements and extracted the flatband voltages from the C-V curves. The C-V results for singly charged ion experiments reveal that the changes in the flatband voltage and slope for implanted devices relative to the pristine devices can be used to delineate effects due to implanted ions only and ion induced damage. The data shows that the flatband voltage shifts and C-V slope changes are energy dependent. The observed changes in flatband voltage which are greater than those predicted by calculations scaled for the ion dose and implantation range (SRIM). These results, however, are consistent with a columnar recombination model, where electron-hole pairs are created due to the energy deposited by the implanted ions within the oxide. The remaining holes left after recombination losses are diffused through the oxide at the room temperature and remain present as trapped charges. Comparison of the data with the total number of the holes generated gives a fractional yield of 0.0124 which is of the same order as prior published high energy irradiation experiments. Additionally, the interface trap density, extracted from high and low frequency C-V measurements is observed to increase by one order of magnitude over our incident beam energy. These results confirm that dose- and kinetic energy -dependent effects can be recorded for singly charged ion irradiation on oxides using this method. Highly charged ion results also confirm that dose as well as and charge-dependent effects can

  17. Low energy ion assisted carbon film growth: Methods and mechanisms

    NASA Astrophysics Data System (ADS)

    Ullmann, Jens

    1997-05-01

    Hydrogen-free amorphous carbon films (a-C) prepared by different ion assisted methods (i) ion assisted evaporation (IAE), (ii) unbalanced magnetron sputtering (MS), (iii) mass separated ion beam deposition (MSIBD) and (iv) filtered vacuum cathodic arc evaporation (VA) in the optimum energy range of about 100 eV were compared. Density data, Raman spectra and surface topography images show a different behaviour of the films. The different growth processes were discussed in connection with results from ion implantation experiments into IAE a-C and computer calculations of the ion-solid interactions by use of the TRIM-code. Self-interstitials in the sub-surface region of the carbon matrix created due to pure carbon ion beam bombardment (MSIBD and VA) are the key for the understanding of the densification process. The lower number of self-interstitials created during the noble-gas ion assisted processes can be compensated by extremely high argon-ion to carbon-neutral arrival ratios in the case of MS. Furthermore, the sputtered carbon atoms with energies in the range of a few eV should assist this deposition process. Without energetic carbon particles (thermal carbon atoms from the evaporation process) as in the case of neon ion assisted evaporation, it is also possible to prepare dense a-C, however with lower density (2.7 g/cm 3).

  18. Electron energy recovery system for negative ion sources

    DOEpatents

    Dagenhart, William K.; Stirling, William L.

    1982-01-01

    An electron energy recovery system for negative ion sources is provided. The system, employs crossed electric and magnetic fields to separate the electrons from ions as they are extracted from a negative ion source plasma generator and before the ions are accelerated to their full kinetic energy. With the electric and magnetic fields oriented 90.degree. to each other, the electrons are separated from the plasma and remain at approximately the electrical potential of the generator in which they were generated. The electrons migrate from the ion beam path in a precessing motion out of the ion accelerating field region into an electron recovery region provided by a specially designed electron collector electrode. The electron collector electrode is uniformly spaced from a surface of the ion generator which is transverse to the direction of migration of the electrons and the two surfaces are contoured in a matching relationship which departs from a planar configuration to provide an electric field component in the recovery region which is parallel to the magnetic field thereby forcing the electrons to be directed into and collected by the electron collector electrode. The collector electrode is maintained at a potential slightly positive with respect to the ion generator so that the electrons are collected at a small fraction of the full accelerating supply voltage energy.

  19. Design study of low energy beam transport line for ion beams of the post-accelerator at RAON

    NASA Astrophysics Data System (ADS)

    Lee, Yumi; Kim, Eun-San

    2015-07-01

    Low-energy ions produced by the ion source pass through the focusing and acceleration sections. During this process, the ions accumulate energy and are finally transported to the apparatus that utilizes them for a specific purpose. Thus, in order to increase the transmission efficiency of the ion beams, the low energy beam transport (LEBT) system must minimize the beam loss and the emittance growth. The LEBT system is designed and optimized to transmit 132Sn16+ and 58Ni8+ beams of the post-accelerator at RAON that is the accelerator complex for the rare isotope science. The post-accelerator LEBT line comprises solenoids and electrostatic quadrupoles for transverse focusing and a multi-harmonic buncher for longitudinal focusing. This paper presents the results of the optical design and beam tracking for the post-accelerator LEBT obtained by using TraceWIN and TRACK codes.

  20. A compact, versatile low-energy electron beam ion source

    SciTech Connect

    Zschornack, G.; König, J.; Schmidt, M.; Thorn, A.

    2014-02-15

    A new compact Electron Beam Ion Source, the Dresden EBIT-LE, is introduced as an ion source working at low electron beam energies. The EBIT-LE operates at an electron energy ranging from 100 eV to some keV and can easily be modified to an EBIT also working at higher electron beam energies of up to 15 keV. We show that, depending on the electron beam energy, electron beam currents from a few mA in the low-energy regime up to about 40 mA in the high-energy regime are possible. Technical solutions as well as first experimental results of the EBIT-LE are presented. In ion extraction experiments, a stable production of low and intermediate charged ions at electron beam energies below 2 keV is demonstrated. Furthermore, X-ray spectroscopy measurements confirm the possibility of using the machine as a source of X-rays from ions excited at low electron energies.

  1. Comparison between single- and dual-electrode ion source systems for low-energy ion transport

    SciTech Connect

    Vasquez, M. Jr.; Tokumura, S.; Kasuya, T.; Maeno, S.; Wada, M.

    2012-11-06

    Extraction of ions with energies below 100 eV has been demonstrated using a hot-cathode multi-cusp ion source equipped with extraction electrodes made of thin wires. Two electrode geometries, a single-electrode system, and a dual-electrode system were built and tested. The single-electrode configuration showed high ion beam current densities at shorter distances from the electrode but exhibited rapid attenuation as the distance from the electrode increased. Beam angular spread measurements showed similar beam divergence for both electrode configurations at low plasma densities. At high plasma densities and low extraction potentials, the single-electrode system showed the angular spread twice as large as that of the dual-electrode system. Energy distribution analyses showed a broader energy spread for ion beams extracted from a single-electrode set-up.

  2. Low energy sputtering of cobalt by cesium ions

    NASA Technical Reports Server (NTRS)

    Handoo, A.; Ray, Pradosh K.

    1989-01-01

    An experimental facility to investigate low energy (less than 500 eV) sputtering of metal surfaces with ions produced by an ion gun is described. Results are reported on the sputtering yield of cobalt by cesium ions in the 100 to 500 eV energy range at a pressure of 1 times 10(exp -6) Torr. The target was electroplated on a copper substrate. The sputtered atoms were collected on a cobalt foil surrounding the target. Co-57 was used as a tracer to determine the sputtering yield.

  3. Model for Cumulative Solar Heavy Ion Energy and LET Spectra

    NASA Technical Reports Server (NTRS)

    Xapsos, Mike; Barth, Janet; Stauffer, Craig; Jordan, Tom; Mewaldt, Richard

    2007-01-01

    A probabilistic model of cumulative solar heavy ion energy and lineary energy transfer (LET) spectra is developed for spacecraft design applications. Spectra are given as a function of confidence level, mission time period during solar maximum and shielding thickness. It is shown that long-term solar heavy ion fluxes exceed galactic cosmic ray fluxes during solar maximum for shielding levels of interest. Cumulative solar heavy ion fluences should therefore be accounted for in single event effects rate calculations and in the planning of space missions.

  4. Super high energy heavy ion collisions

    SciTech Connect

    Geist, W.M.

    1987-12-01

    Basic theoretical ideas on a phase transition to a plasma of free quarks and gluons in heavy ion collisions are outlined. First results from experiments with oxygen beams at 14.5 GeV/c/N (BNL), 60 and 200 GeV/c/N (CERN) are discussed. 30 refs., 9 figs.

  5. Use of low energy hydrogen ion implants in high efficiency crystalline silicon solar cells

    NASA Technical Reports Server (NTRS)

    Fonash, S. J.; Singh, R.

    1985-01-01

    This program is a study of the use of low energy hydrogen ion implantation for high efficiency crystalline silicon solar cells. The first quarterly report focuses on two tasks of this program: (1) an examination of the effects of low energy hydrogen implants on surface recombination speed; and (2) an examination of the effects of hydrogen on silicon regrowth and diffusion in silicon. The first part of the project focussed on the measurement of surface properties of hydrogen implanted silicon. Low energy hydrogen ions when bombarded on the silicon surface will create structural damage at the surface, deactivate dopants and introduce recombination centers. At the same time the electrically active centers such as dangling bonds will be passivated by these hydrogen ions. Thus hydrogen is expected to alter properties such as the surface recombination velocity, dopant profiles on the emitter, etc. In this report the surface recombination velocity of a hydrogen emplanted emitter was measured.

  6. Science Requirements and Conceptual Design for a Polarized Medium Energy Electron-Ion Collider at Jlab

    SciTech Connect

    Abeyratne, S; Ahmed, S; Barber, D; Bisognano, J; Bogacz, A; Castilla, A; Chevtsov, P; Corneliussen, S; Deconinck, W; Degtiarenko, P; Delayen, J; Derbenev, Ya; DeSilva, S; Douglas, D; Dudnikov, V; Ent, R; Erdelyi, B; Evtushenko, P; Fujii, Yu; Filatov, Yury; Gaskell, D; Geng, R; Guzey, V; Horn, T; Hutton, A; Hyde, C; Johnson, R; Kim, Y; Klein, F; Kondratenko, A; Kondratenko, M; Krafft, G; Li, R; Lin, F; Manikonda, S; Marhauser, F; McKeown, R; Morozov, V; Dadel-Turonski, P; Nissen, E; Ostroumov, P; Pivi, M; Pilat, F; Poelker, M; Prokudin, A; Rimmer, R; Satogata, T; Sayed, H; Spata, M; Sullivan, M; Tennant, C; Terzic, B; Tiefenback, M; Wang, M; Wang, S; Weiss, C; Yunn, B; Zhang, Y

    2012-08-01

    beginning, the design studies at Jefferson Lab have focused on achieving high collider performance, particularly ultrahigh luminosities up to 10{sup 34} cm{sup -2}s{sup -1} per detector with large acceptance, while maintaining high polarization for both the electron and light-ion beams. These are the two key performance requirements of a future electron-ion collider facility as articulated by the NSAC Long Range Plan. In MEIC, a new ion complex is designed specifically to deliver ion beams that match the high bunch repetition and highly polarized electron beam from CEBAF. During the last two years, both development of the science case and optimization of the machine design point toward a medium-energy electron-ion collider as the topmost goal for Jefferson Lab. The MEIC, with relatively compact collider rings, can deliver a luminosity above 10{sup 34} cm{sup -2}s{sup -1} at a center-of-mass energy up to 65 GeV. It offers an electron energy up to 11 GeV, a proton energy up to 100 GeV, and corresponding energies per nucleon for heavy ions with the same magnetic rigidity. This design choice balances the scope of the science program, collider capabilities, accelerator technology innovation, and total project cost. An energy upgrade could be implemented in the future by adding two large collider rings housed in another large tunnel to push the center-of-mass energy up to or exceeding 140 GeV. After careful consideration of an alternative electron energy recovery linac on ion storage ring approach, a ring-ring collider scenario at high bunch repetition frequency was found to offer fully competitive performance while eliminating the uncertainties of challenging R&D on ampere-class polarized electron sources and many-pass energy-recovery linacs (ERLs). The essential new elements of an MEIC facility at Jefferson Lab are an electron storage ring and an entirely new, modern ion acceleration and storage complex. For the high-current electron collider ring, the upgraded 12 GeV CEBAF SRF

  7. Figures of merit for focusing mega-electron-volt ion beams in biomedical imaging and proton beam writing

    SciTech Connect

    Ren Minqin; Whitlow, Harry J.; Ananda Sagari, A. R.; Kan, Jeroen A. van; Osipowicz, Thomas; Watt, Frank

    2008-01-01

    A figure of merit (FOM) has been developed for focusing quadrupole multiplet lenses for ion micro- and nanobeam systems. The method which is based on measurement of the central peak of the two-dimensional autocorrelation function of an image provides separate FOM for the horizontal and vertical directions. The approach has been tested by comparison with the edge widths obtained by nonlinear fitting the edge widths of a Ni grid and found to be reliable. The FOM has the important advantage for ion beam imaging of biomedical samples that the fluence needed is considerably lower than for edge fitting.

  8. Repairing amplitude defects in multilayer-coated extreme-ultraviolet lithography reticles by use of a focused ion beam.

    PubMed

    Barty, Anton; Hau-Riege, Stefan; Stearns, Dan; Clift, Miles; Mirkarimi, Paul; Gullikson, Eric; Chapman, Henry; Sweeney, Don

    2004-12-20

    We present a method for repairing defects near the top surfaces of multilayer coatings in general and specifically on extreme-ultraviolet lithography mask blanks. Milling away the defect and a surrounding region of the multilayer by use of a focused ion beam can repair both the reflectivity and the phase of the reflected light in the vicinity of such a defect. We describe the conditions under which the repaired region will not itself be a defect and experimentally demonstrate the feasibility of this multilayer repair technique. The results described are also applicable to understanding and controlling the optical effects of ion-induced multilayer erosion.

  9. ENERGY SPECTRUM OF ENERGETIC PARTICLES ACCELERATED BY SHOCK WAVES: FROM FOCUSED TRANSPORT TO DIFFUSIVE ACCELERATION

    SciTech Connect

    Zuo Pingbing; Zhang Ming; Gamayunov, Konstantin; Rassoul, Hamid; Luo Xi

    2011-09-10

    The focused transport equation (FTE) includes all the necessary physics for modeling the shock acceleration of energetic particles with a unified description of first-order Fermi acceleration, shock drift acceleration, and shock surfing acceleration. It can treat the acceleration and transport of particles with an anisotropic distribution. In this study, the energy spectrum of pickup ions accelerated at shocks of various obliquities is investigated based on the FTE. We solve the FTE by using a stochastic approach. The shock acceleration leads to a two-component energy spectrum. The low-energy component of the spectrum is made up of particles that interact with shock one to a few times. For these particles, the pitch angle distribution is highly anisotropic, and the energy spectrum is variable depending on the momentum and pitch angle of injected particles. At high energies, the spectrum approaches a power law consistent with the standard diffusive shock acceleration (DSA) theory. For a parallel shock, the high-energy component of the power-law spectrum, with the spectral index being the same as the prediction of DSA theory, starts just a few times the injection speed. For an oblique or quasi-perpendicular shock, the high-energy component of the spectrum exhibits a double power-law distribution: a harder power-law spectrum followed by another power-law spectrum with a slope the same as the spectral index of DSA. The shock acceleration will eventually go into the DSA regime at higher energies even if the anisotropy is not small. The intensity of the energy spectrum given by the FTE, in the high-energy range where particles get efficient acceleration in the DSA regime, is different from that given by the standard DSA theory for the same injection source. We define the injection efficiency {eta} as the ratio between them. For a parallel shock, the injection efficiency is less than 1, but for an oblique shock or a quasi-perpendicular shock it could be greater.

  10. Heating of ions to superthermal energies in the topside ionosphere by electrostatic ion cyclotron waves

    NASA Technical Reports Server (NTRS)

    Ungstrup, E.; Klumpar, D. M.; Heikkila, W. J.

    1979-01-01

    The soft particle spectrometer on the Isis 2 spacecraft occasionally observes fluxes of ions moving upward out of the ionosphere in the vicinity of the auroral oval. These ion fluxes are characterized by a sharp pitch angle distribution usually peaked at an angle somewhat greater than 90 deg, indicative of particles heated to a large transverse temperature in a narrow range below the spacecraft. The observations are interpreted in terms of electrostatic ion cyclotron waves, which heat the ions to superthermal energies transverse to the earth's magnetic field. When the transverse energy increases, the repulsive force of the earth's magnetic field, proportional to the particle magnetic moment, repels the particles away from the earth.

  11. Energy spread of ion beams passing a gas stripper

    NASA Astrophysics Data System (ADS)

    Hartmann, B.; Kalbitzer, S.; Klatt, Ch.

    1997-05-01

    Since the energy spread of accelerated particle beams is not well known for tandem-type machines, we have measured current-energy distributions for a variety of ion beams delivered by our 3 MV tandem at varying stripper gas pressure. The energy widths of light ions produced from injected negatively charged atoms, such as H - and Fe -, are mainly due to the accelerating voltage ripple, whereas for heavier ions, such as C - and F -, energy straggling in the stripper gas dominates. In case of injected negatively charged molecules, such as NH 2- and CN -, Coulomb explosion in the gas stripper produces satellite peaks on both sides of the unshifted central line. These deviations from Gaussian line shape complicate precise lineshape analyses, as, for example, required in nuclear reaction Doppler spectrometry of vibrational states in target materials. The most relevant charge-exchange processes in the stripper gas will be discussed in some detail.

  12. Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling

    PubMed Central

    Mayer, Marcel; Keskinbora, Kahraman; Grévent, Corinne; Szeghalmi, Adriana; Knez, Mato; Weigand, Markus; Snigirev, Anatoly; Snigireva, Irina; Schütz, Gisela

    2013-01-01

    Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ∼10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficulties of manufacturing high-aspect-ratio zone plates using conventional techniques. Here, employing a method of fabrication based on atomic layer deposition (ALD) and focused ion beam (FIB) milling, FZPs with very high aspect ratios were prepared. Such multilayer FZPs with outermost zone widths of 10 and 35 nm and aspect ratios of up to 243 were tested for their focusing properties at 8 keV and shown to focus hard X-rays efficiently. This success was enabled by the outstanding layer quality thanks to ALD. Via the use of FIB for slicing the multilayer structures, desired aspect ratios could be obtained by precisely controlling the thickness. Experimental diffraction efficiencies of multilayer FZPs fabricated via this combination reached up to 15.58% at 8 keV. In addition, scanning transmission X-ray microscopy experiments at 1.5 keV were carried out using one of the multilayer FZPs and resolved a 60 nm feature size. Finally, the prospective of different material combinations with various outermost zone widths at 8 and 17 keV is discussed in the light of the coupled wave theory and the thin-grating approximation. Al2O3/Ir is outlined as a promising future material candidate for extremely high resolution with a theoretical efficiency of more than 20% for as small an outermost zone width as 10 nm at 17 keV. PMID:23592622

  13. Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling.

    PubMed

    Mayer, Marcel; Keskinbora, Kahraman; Grévent, Corinne; Szeghalmi, Adriana; Knez, Mato; Weigand, Markus; Snigirev, Anatoly; Snigireva, Irina; Schütz, Gisela

    2013-05-01

    Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ~10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficulties of manufacturing high-aspect-ratio zone plates using conventional techniques. Here, employing a method of fabrication based on atomic layer deposition (ALD) and focused ion beam (FIB) milling, FZPs with very high aspect ratios were prepared. Such multilayer FZPs with outermost zone widths of 10 and 35 nm and aspect ratios of up to 243 were tested for their focusing properties at 8 keV and shown to focus hard X-rays efficiently. This success was enabled by the outstanding layer quality thanks to ALD. Via the use of FIB for slicing the multilayer structures, desired aspect ratios could be obtained by precisely controlling the thickness. Experimental diffraction efficiencies of multilayer FZPs fabricated via this combination reached up to 15.58% at 8 keV. In addition, scanning transmission X-ray microscopy experiments at 1.5 keV were carried out using one of the multilayer FZPs and resolved a 60 nm feature size. Finally, the prospective of different material combinations with various outermost zone widths at 8 and 17 keV is discussed in the light of the coupled wave theory and the thin-grating approximation. Al2O3/Ir is outlined as a promising future material candidate for extremely high resolution with a theoretical efficiency of more than 20% for as small an outermost zone width as 10 nm at 17 keV.

  14. Locally Appropriate Energy Strategies for the Developing World: A focus on Clean Energy Opportunities in Borneo

    NASA Astrophysics Data System (ADS)

    Shirley, Rebekah Grace

    This dissertation focuses on an integration of energy modeling tools to explore energy transition pathways for emerging economies. The spate of growth in the global South has led to a global energy transition, evidenced in part by a surge in the development of large scale energy infrastructure projects for the provision of reliable electricity service. The rational of energy security and exigency often usher these large scale projects through to implementation with minimal analysis of costs: social and environmental impact, ecological risk, or opportunity costs of alternative energy transition pathways foregone. Furthermore, development of energy infrastructure is inherently characterized by the involvement of a number of state and non-state actors, with varying interests, objectives and access to authority. Being woven through and into social institutions necessarily impacts the design, control and functionality of infrastructure. In this dissertation I therefore conceptualize energy infrastructure as lying at the intersection, or nexus, of people, the environment and energy security. I argue that energy infrastructure plans and policy should, and can, be informed by each of these fields of influence in order to appropriately satisfy local development needs. This case study explores the socio-techno-environmental context of contemporary mega-dam development in northern Borneo. I describe the key actors of an ongoing mega-dam debate and the constellation of their interaction. This highlights the role that information may play in public discourse and lends insight into how inertia in the established system may stymie technological evolution. I then use a combination of power system simulation, ecological modeling and spatial analysis to analyze the potential for, and costs and tradeoffs of, future energy scenarios. In this way I demonstrate reproducible methods that can support energy infrastructure decision making by directly addressing data limitation barriers. I

  15. Altering the luminescence properties of self-assembled quantum dots in GaAs by focused ion beam implantation

    NASA Astrophysics Data System (ADS)

    Rothfuchs, Charlotte; Kukharchyk, Nadezhda; Greff, Markus K.; Wieck, Andreas D.; Ludwig, Arne

    2016-03-01

    Using quantum dots (QDs) as single-photon sources draws the attention in many quantum communication technologies. One pathway towards manufacturing single-photon sources is focused ion beam (FIB) implantation in molecular beam epitaxy-grown QD samples to disable all QDs around an intentional one for single photoluminescence (PL) emission. In this paper, we investigate the lattice disorders in the vicinity of InAs/GaAs QDs introduced by FIB implantation of gallium and indium ions. For high fluences, we achieve total elimination of the QDs photoluminescence. The impact of the different ion species and fluences is studied by low-temperature PL measurements. Furthermore, we deduce a simple model based on the trap-assisted recombination for the description of the degradation of the PL emission. It allows the determination of the fluences at which the PL emission is suppressed. Moreover, we identify the implantation-induced non-radiative defects by temperature-dependent PL measurements.

  16. Ion focusing and interaction potential for spherical and rodlike obstacles in a supersonic plasma flow: numerical simulations

    SciTech Connect

    Miloch, W. J.; Pecseli, H. L.; Trulsen, J.; Vladimirov, S. V.

    2008-09-07

    The parameter dependence of the ion focus behind perfectly conducting or alternatively perfectly insulating spherical grains for different electron to ion temperature ratios is studied. For elongated, insulating dust grains we study the potential and plasma density wakes in drifting plasma for rods or plates of different lengths and different inclination angles. These two characteristics (i.e., the rod length and the inclination angle are important for the exact charge distribution on the surface and the wake pattern. For this case we discuss also the interaction potential between two elongated grains in a flowing plasma.Our simulations are carried out in two spatial dimensions by a Particle-in-Cell code, treating ions and electrons as individual particles. These studies can be relevant for finite size dust grains suspended in a plasma sheath or larger objects in space, e.g., meteoroids.

  17. Interactions of Low-Energy Spin-Polarized ^4He^+ Ions with Au(100)

    NASA Astrophysics Data System (ADS)

    Bixler, D. L.; Lancaster, J. C.; Popple, R. A.; Dunning, F. B.; Walters, G. K.

    1998-05-01

    A spin polarized He^+ ion source has been developed to study the dynamics of ion-surface interactions. The He^+ ions are produced by Penning ionization in collisions between electron-spin-polarized He(2^3S) metastable atoms contained in a weak rf-excited discharge. The ions are extracted from the discharge and focused onto a clean Au(100) surface using a series of electrostatic lenses. The impact energy can be varied from <=10eV to >=650eV and typical beam polarizations are 10-15%. Measurements of the polarization of electrons ejected from the surface as a result of Auger neutralization reveal spin correlation that can be explained by considering the local perturbation in the surface electronic structure induced by the presence of the (polarized) He^+ ion. The calculated induced densities of states are spin dependent and exhibit sharp Kondo-like features near the Fermi level. These features, and their influence on Auger neutralization, are being further explored through measurements at several different incident ion energies. *This research is support by the U. S. Department of Energy and the Robert A. Welch Foundation.

  18. Transmission of low energy (< 10 eV) oxygen ions through ultrathin xenon films

    NASA Astrophysics Data System (ADS)

    Sack, N. J.; Akbulut, M.; Madey, T. E.

    1994-05-01

    In studies of desorption induced by electronic transitions (DIET) such as electron or photon stimulated desorption, it is important to know whether the desorbing species originate solely from the outermost surface layer, or also from layers beneath the surface. In order to gain better understanding of the charge transfer, elastic scattering, and other inelastic processes involved in this issue, we are currently performing a series of experimental studies of the transmission of low energy ions (˜ 7 eV) through ultrathin films (submonolayer to multilayer) of condensed gases. Here we report on the first quantitative measurements of the yield, angle, and energy of oxygen ions after transmission through ultrathin films of xenon. In our novel approach, a focused 300 eV electron beam bombards a target at 25 K consisting of an oxidized tungsten (100) crystal with adsorbed overlayers of xenon. In the absence of the xenon, O + ions desorb in a sharp beam normal to the surface, as measured in a velocity and angle resolving ESDIAD apparatus (electron stimulated desorption ion angular distribution). When Xe layers are present, some oxygen ions penetrate several monolayers of xenon without significant change in energy and angle while others seem to be scattered by large-angle elastic scattering or to be attenuated from the O + beam. The work presented is the first experimental study of the depth of origin of desorbing ions in DIET processes.

  19. Inverse energy dispersion of energetic ions observed in the magnetosheath

    NASA Astrophysics Data System (ADS)

    Lee, S. H.; Sibeck, D. G.; Hwang, K.-J.; Wang, Y.; Silveira, M. V. D.; Fok, M.-C.; Mauk, B. H.; Cohen, I. J.; Ruohoniemi, J. M.; Kitamura, N.; Burch, J. L.; Giles, B. L.; Torbert, R. B.; Russell, C. T.; Lester, M.

    2016-07-01

    We present a case study of energetic ions observed by the Energetic Particle Detector (EPD) on the Magnetospheric Multiscale spacecraft in the magnetosheath just outside the subsolar magnetopause that occurred at 1000 UT on 8 December 2015. As the magnetopause receded inward, the EPD observed a burst of energetic (˜50-1000 keV) proton, helium, and oxygen ions that exhibited an inverse dispersion, with the lowest energy ions appearing first. The prolonged interval of fast antisunward flow observed in the magnetosheath and transient increases in the H components of global ground magnetograms demonstrate that the burst appeared at a time when the magnetosphere was rapidly compressed. We attribute the inverse energy dispersion to the leakage along reconnected magnetic field lines of betatron-accelerated energetic ions in the magnetosheath, and a burst of reconnection has an extent of about 1.5 RE using combined Super Dual Auroral Radar Network radar and EPD observations.

  20. Relationship between wave energy and free energy from pickup ions in the Comet Halley environment

    NASA Technical Reports Server (NTRS)

    Huddleston, D. E.; Johnstone, A. D.

    1992-01-01

    The free energy available from the implanted heavy ion population at Comet Halley is calculated by assuming that the initial unstable velocity space ring distribution of the ions evolves toward a bispherical shell. Ultimately this free energy adds to the turbulence in the solar wind. Upstream and downstream free energies are obtained separately for the conditions observed along the Giotto spacecraft trajectory. The results indicate that the waves are mostly upstream propagating in the solar wind frame. The total free energy density always exceeds the measured wave energy density because, as expected in the nonlinear process of ion scattering, the available energy is not all immediately released. An estimate of the amount which has been released can be obtained from the measured oxygen ion distributions and again it exceeds that observed. The theoretical analysis is extended to calculate the k spectrum of the cometary-ion-generated turbulence.

  1. Development of a strongly focusing high-intensity He{sup +} ion source for a confined alpha particle measurement at ITER

    SciTech Connect

    Kisaki, M.; Shinto, K.; Kobuchi, T.; Okamoto, A.; Kitajima, S.; Sasao, M.; Tsumori, K.; Nishiura, M.; Kaneko, O.; Matsuda, Y.; Wada, M.; Sakakita, H.; Kiyama, S.; Hirano, Y.

    2008-02-15

    A strongly focusing high-intensity He{sup +} ion source has been designed and constructed as a beam source for a high-energy He{sup 0} beam probe system for diagnosis of fusion produced alpha particles in the thermonuclear fusion plasmas. The He{sup +} beam was extracted from the ion source at an acceleration voltage of 18-35 kV. Temperature distributions of the beam target were observed with an IR camera. The 1/e-holding beam profile half-width was about 15 mm at optimum perveance (Perv) of 0.03 (I{sub beam}=2.4 A). A beam current about 3 A was achieved at an acceleration voltage of 26.7 kV with an arc power of 10 kW (Perv=0.023)

  2. Development of Lithium-ion Battery as Energy Storage for Mobile Power Sources Applications

    NASA Astrophysics Data System (ADS)

    Sulaiman, Mohd Ali; Hasan, Hasimah

    2009-09-01

    In view of the need to protect the global environment and save energy, there has been strong demand for the development of lithium-ion battery technology as a energy storage system, especially for Light Electric Vehicle (LEV) and electric vehicles (EV) applications. The R&D trend in the lithium-ion battery development is toward the high power and energy density, cheaper in price and high safety standard. In our laboratory, the research and development of lithium-ion battery technology was mainly focus to develop high power density performance of cathode material, which is focusing to the Li-metal-oxide system, LiMO2, where M=Co, Ni, Mn and its combination. The nano particle size material, which has irregular particle shape and high specific surface area was successfully synthesized by self propagating combustion technique. As a result the energy density and power density of the synthesized materials are significantly improved. In addition, we also developed variety of sizes of lithium-ion battery prototype, including (i) small size for electronic gadgets such as mobile phone and PDA applications, (ii) medium size for remote control toys and power tools applications and (iii) battery module for high power application such as electric bicycle and electric scooter applications. The detail performance of R&D in advanced materials and prototype development in AMREC, SIRIM Berhad will be discussed in this paper.

  3. Traverse Focusing of Intense Charged Particle Beams with Chromatic Effects for Heavy Ion Fusion

    SciTech Connect

    James M. Mitrani, Igor D. Kaganovich, Ronald C. Davidson

    2013-01-28

    A fi nal focusing scheme designed to minimize chromatic effects is discussed. The Neutralized Drift Compression Experiment-II (NDCX-II) will apply a velocity tilt for longitudinal bunch compression, and a fi nal focusing solenoid (FFS) for transverse bunch compression. In the beam frame, neutralized drift compression causes a suffi ciently large spread in axial momentum, pz , resulting in chromatic effects to the fi nal focal spot during transverse bunch compression. Placing a weaker solenoid upstream of a stronger fi nal focusing solenoid (FFS) mitigates chromatic effects and improves transverse focusing by a factor of approximately 2-4 for appropriate NDCX-II parameters.

  4. Ion collector design for an energy recovery test proposal with the negative ion source NIO1

    NASA Astrophysics Data System (ADS)

    Variale, V.; Cavenago, M.; Agostinetti, P.; Sonato, P.; Zanotto, L.

    2016-02-01

    Commercial viability of thermonuclear fusion power plants depends also on minimizing the recirculation power used to operate the reactor. The neutral beam injector (NBI) remains one of the most important method for plasma heating and control. For the future fusion power plant project DEMO, a NBI wall plug efficiency at least of 0.45 is required, while efficiency of present NBI project is about 0.25. The D- beam from a negative ion source is partially neutralized by a gas cell, which leaves more than 40% of energy in residual beams (D- and D+), so that an ion beam energy recovery system can significantly contribute to optimize efficiency. Recently, the test negative ion source NIO1 (60 keV, 9 beamlets with 15 mA H- each) has been designed and built at RFX (Padua) for negative ion production efficiency and the beam quality optimization. In this paper, a study proposal to use the NIO1 source also for a beam energy recovery test experiment is presented and a preliminary design of a negative ion beam collector with simulations of beam energy recovery is discussed.

  5. Ion collector design for an energy recovery test proposal with the negative ion source NIO1.

    PubMed

    Variale, V; Cavenago, M; Agostinetti, P; Sonato, P; Zanotto, L

    2016-02-01

    Commercial viability of thermonuclear fusion power plants depends also on minimizing the recirculation power used to operate the reactor. The neutral beam injector (NBI) remains one of the most important method for plasma heating and control. For the future fusion power plant project DEMO, a NBI wall plug efficiency at least of 0.45 is required, while efficiency of present NBI project is about 0.25. The D(-) beam from a negative ion source is partially neutralized by a gas cell, which leaves more than 40% of energy in residual beams (D(-) and D(+)), so that an ion beam energy recovery system can significantly contribute to optimize efficiency. Recently, the test negative ion source NIO1 (60 keV, 9 beamlets with 15 mA H(-) each) has been designed and built at RFX (Padua) for negative ion production efficiency and the beam quality optimization. In this paper, a study proposal to use the NIO1 source also for a beam energy recovery test experiment is presented and a preliminary design of a negative ion beam collector with simulations of beam energy recovery is discussed. PMID:26932033

  6. Planar nanosized field emission cathodes on the basis of graphene/semi-insulating silicon carbide fabricated by focused ion beam

    NASA Astrophysics Data System (ADS)

    Jityaev, L.; Ageev, O. A.; Svetlichnyi, A. M.; Kolomiytsev, A. S.; Spiridonov, O. B.

    2016-08-01

    We investigate the field emission properties of planar graphene structures with nanosized interelectrode distance. The graphene was obtained by thermal decomposition of silicon carbide in vacuum. Planar field emission structures on the basis of graphene on semiinsulating SiC were fabricated by using focused ion beam. We have performed current-voltage measurement on graphene/SiC field emission cathodes. The planar field emission structures showed a threshold voltage less than 1 V.

  7. Isotope analysis in central heavy ion collisions at intermediate energies

    NASA Astrophysics Data System (ADS)

    Geraci, E.; Abbondanno, U.; Bardelli, L.; Barlini, S.; Bini, M.; Bruno, M.; Cannata, F.; Casini, G.; Chiari, M.; D'Agostino, M.; de Sanctis, J.; Giussani, A.; Gramegna, F.; Kravchuk, V. L.; Lanchais, A. L.; Marini, P.; Moroni, A.; Nannini, A.; Olmi, A.; Ordine, A.; Pasquali, G.; Piantelli, S.; Poggi, G.; Vannini, G.; Nucl-Ex Collaboration

    2007-11-01

    Symmetry energy is a key quantity in the study of the equation of state of asymmetric nuclear matter. Heavy ion collisions at low and intermediate energies, performed at Laboratori Nazionali di Legnaro and Laboratori Nazionali del Sud, can be used to extract information on the symmetry energy coefficient Csym, which is currently poorly known but relevant both for astrophysics and for deeper knowledge of the structure of exotic nuclei.

  8. Surface Modification Energized by Focused Ion Beam: The Influence of Etch Rates & Aspect Ratio on Ripple Wavelengths.

    SciTech Connect

    MoberlyChan, W J

    2006-11-15

    Ion beams have been used to modify surface topography, producing nanometer-scale modulations (and even subnanometer ripples in this work) that have potential uses ranging from designing self-assembly structures, to controlling stiction of micromachined surfaces, to providing imprint templates for patterned media. Modern computer-controlled Focused Ion Beam tools enable alternating submicron patterned zones of such ion-eroded surfaces, as well as dramatically increasing the rate of ion beam processing. The DualBeam FIB/SEM also expedites process development while minimizing the use of materials that may be precious (Diamond) and/or produce hazardous byproducts (Beryllium). A FIB engineer can prototype a 3-by-3-by-3 matrix of variables in tens of minutes and consume as little as zeptoliters of material; whereas traditional ion beam processing would require tens of days and tens of precious wafers. Saturation wavelengths have been reported for ripples on materials such as single crystal silicon or diamond ({approx}200nm); however this work achieves wavelengths >400nm on natural diamond. Conversely, Be can provide a stable and ordered 2-dimensional array of <40nm periodicity; and ripples <0.4nm are also fabricated on carbon surfaces and quantified by HR-TEM and electron diffraction. Rippling is a function of material, ion beam, and angle; but is also controlled by chemical environment, redeposition, and aspect ratio. Ideally a material exhibits a constant yield (atoms sputtered off per incident ion); however, pragmatic FIB processes, coupled with the direct metrological feedback in a DualBeam tool, reveal etch rates do not remain constant for nanometer-scale processing. Control of rippling requires controlled metrology, and robust software tools are developed to enhance metrology. In situ monitoring of the influence of aspect ratio and redeposition at the micron scale correlates to the rippling fundamentals that occur at the nanometer scale and are controlled by the

  9. Analytical electron microscopy and focused ion beam: complementary tool for the imaging of copper sorption onto iron oxide aggregates.

    PubMed

    Mavrocordatos, D; Steiner, M; Boller, M

    2003-04-01

    Nanometre-scale electron spectroscopic imaging has been applied to characterize the operation of a copper filtration plant in environmental science. Copper washed off from roofs and roads is considered to be a major contributor to diffuse copper pollution of urban environments. A special adsorber system has been suggested to control the diffusion of copper fluxes by retaining Cu with a granulated iron hydroxide. The adsorber was tested over an 18-month period on facade runoff. The concentrations range of Cu in the runoff water was measured between 10 and 1000 p.p.m. and could be reduced by between 96% and 99% in the adsorption ditch. Before the analysis of the adsorber, the suspended material from the inflow was ultracentrifuged onto TEM grids and analysed by energy-filtered transmission electron microscopy (EFTEM). Copper was found either as small precipitates 5-20 nm in size or adsorbed onto organic and inorganic particles. This Cu represents approximately 30% of the total dissolved Cu, measured by atomic emission spectrometry. To locate where the copper sorption takes place within the adsorber, the granulated iron oxide was analysed by analytical electron microscopy after exposure to the roof run-off water. A section of the granulated iron hydroxide was prepared by focused ion beam milling. The thickness of the lamina was reduced to 100 nm and analysed by EFTEM. The combination of these two techniques allowed us to observe the diffusion of Cu into the aggregate of Fe. Elemental maps of Fe and Cu revealed that copper was not only present at the surface of the granules but was also sorbed onto the fine particles inside the adsorber.

  10. Bremsstrahlung spectra from atoms and ions at low relativistic energies

    NASA Astrophysics Data System (ADS)

    Avdonina, N. B.; Pratt, R. H.

    1999-09-01

    Analytic expressions for bremsstrahlung spectra from neutral atoms and ions, including the polarizational bremsstrahlung contribution in a stripped atom approximation, are developed for electron scattering at energies of 10-2000 keV. A modified Elwert factor and a simple higher Born correction are used for the Coulomb spectrum, with ordinary bremsstrahlung screening effects in ions and atoms adequately characterized in the non-relativistic Born approximation. In parallel with the development of this analytic description, new numerical results are obtained for ordinary bremsstrahlung from ions and from bare nuclei, appreciably extending the available data set which can be used to study dependences on element, ionicity, energy and the fraction of incident energy radiated. The accuracy of predictions with the analytic expressions is then determined by comparison with the full numerical relativistic partial-wave results for ordinary bremsstrahlung and with non-relativistic numerical results in the Born approximation or in partial waves for the polarizational amplitude.

  11. Observations of Reflected Ions and Plasma Turbulence for Satellite Potentials Greater than the Ion Ram Energy

    NASA Technical Reports Server (NTRS)

    Wright, K. H., Jr.; Stone, N. H.; Sorensen, J.; Winningham, J. D.; Gurgiolo, C.

    1998-01-01

    During the TSS-1R mission, the behavior of the ions flowing from the forward hemisphere of the Tethered Satellite System (TSS) satellite was examined as the potential of the satellite was changed from below to above 5 V. The ram energy of the ambient atomic oxygen ions is approximately 5 eV. For satellite potentials less than 5 V, no ions were observed on the ram side of the satellite. When the satellite potential was raised greater than 5 V, ions were observed to be flowing from the forward region of the satellite. In the region sampled, the ion flux was a few percent of the ambient with energies of approximately 5 eV. The temperature of the out-flowing ions was observed to be enhanced, relative to the ambient ionosphere. The net current to the probe package became much more noisy for satellite potentials greater than 5 V as compared with satellite potentials less than 5 V, indicating a more disturbed plasma environment.

  12. Observations of Reflected Ions and Plasma Turbulence for Satellite Potentials Greater Than the Ion Ram Energy

    NASA Technical Reports Server (NTRS)

    Wright, K. H., Jr.; Stone, N. H.; Sorensen, J.; Winningham, J. D.; Gurgiolo, C.

    1997-01-01

    During the TSS-1R mission, the behavior of the ions flowing from the forward hemisphere of the Tethered Satellite System (TSS) satellite was examined as the potential on the satellite was changed from below to above 5 Volts. The ram energy of the ambient atomic oxygen ions is about 5 eV. For satellite potentials less than 5 V, no ions were observed on the ram side of the satellite. When the satellite potential was raised above 5 V, ions were observed to be flowing from the forward region of the satellite. In the region sampled, the ion flux was a few percent of the ambient with energies of about 5 eV. The temperature of the outflowing ions was observed to be enhanced, relative to the ambient ionosphere, and had a maximum in a plane containing the center of the satellite and normal to the geomagnetic field. The net current to the probe package became much more noisy for satellite potentials above 5 V as compared with satellite potentials below 5 V indicating a more disturbed plasma environment.

  13. Improved wear properties of high energy ion-implanted polycarbonate

    SciTech Connect

    Rao, G.R.; Lee, E.H. ); Bhattacharya, R.; McCormick, A.W. )

    1995-01-01

    Polycarbonate (Lexan[sup TM]) (PC) was implanted with 2 MeV B[sup +] and O[sup +] ions separately to fluences of 5[times]10[sup 17], 1[times]10[sup 18], and 5[times]10[sup 18] ions/m[sup 2], and characterized for changes in surface hardness and tribological properties. Results of tests showed that hardness values of all implanted specimens increased over those of the unirradiated material, and the O[sup +] implantation was more effective in improving hardness for a given fluence than the B[sup +] implantation. Reciprocating sliding wear tests using a nylon ball counterface yielded significant improvements for all implanted specimens except for the 5[times]10[sup 17] ions/m[sup 2] B[sup +]-implanted PC. Wear tests conducted with a 52100 steel ball yielded significant improvements for the highest fluence of 5[times]10[sup 18] ions/m[sup 2] for both ions, but not for the two lower fluences. The improvements in properties were related to Linear Energy Transfer (LET) mechanisms, where it was shown that the O[sup +] implantation caused greater ionization, thereby greater cross-linking at the surface corresponding to much better improvements in properties. The results were also compared with a previous study on PC using 200 keV B[sup +] ions. The present study indicates that high energy ion irradiation produces thicker, more cross-linked, harder, and more wear-resistant surfaces on polymers and thereby improves properties to a greater extent and more efficiently than lower energy ion implantation.

  14. Energy loss of coasting gold ions and deuterons in RHIC.

    SciTech Connect

    Abreu,N.; Blaskiewicz, M.; Brown, K.A.; Butler, J.J.; FischW; Harvey, M.; Tepikian, S.

    2008-06-23

    The total energy loss of coasting gold ion beams was measured at RHIC at two energies, corresponding to a gamma of 75.2 and 107.4. We describe the experiment and observations and compare the measured total energy loss with expectations from ionization losses at the residual gas, the energy loss due to impedance and synchrotron radiation. We find that the measured energy losses are below what is expected from free space synchrotron radiation. We believe that this shows evidence for suppression of synchrotron radiation which is cut off at long wavelength by the presence of the conducting beam pipe.

  15. Range and Energy Straggling in Ion Beam Transport

    NASA Technical Reports Server (NTRS)

    Wilson, John W.; Tai, Hsiang

    2000-01-01

    A first-order approximation to the range and energy straggling of ion beams is given as a normal distribution for which the standard deviation is estimated from the fluctuations in energy loss events. The standard deviation is calculated by assuming scattering from free electrons with a long range cutoff parameter that depends on the mean excitation energy of the medium. The present formalism is derived by extrapolating Payne's formalism to low energy by systematic energy scaling and to greater depths of penetration by a second-order perturbation. Limited comparisons are made with experimental data.

  16. Ions in the Enceladus plume: Cassini/CAPS ion measurements at high energy resolution

    NASA Astrophysics Data System (ADS)

    Crary, F.; Coates, A. J.; Hill, T. W.; Jones, G. H.; Tokar, R. L.

    2012-12-01

    During several Cassini encounters with Saturn's satellite, Enceladus, the spacecraft crossed through the plume of water vapor and dust south of the satellite with a spacecraft orientation which allowed the Cassini Plasma Spectrometer (CAPS) to observe ions and nanograin dust particles associated with the plume. During three of these encounters, E7 (November 2, 2009), E17 (March XX, 2012) and E18 (April YY, 2012), the trajectories were very similar and parallel to the equatorial plane (i.e. little north-south velocity, so that the spacecraft moved perpendicular to the rotation axis of Enceladus.) Previous analysis, using data from the CAPS ion mass spectrometer (IMS) and electron spectrometer (ELS), identified cold ions at rest with respect to Enceladus [1], negative water group and water cluster ions [2], and both positively and negatively charged dust particles in the 0.5 to 2 nm (1000 to 20,000 AMU) size range [3,4]. We present observations from the third CAPS sensor, the ion beam spectrometer (IBS). Although this sensor lacks the angular resolution of the other CAPS sensors, it has an energy resolution of 1.4%, roughly an order of magnitude greater than the ELS and IMS sensors. The IBS data allows us to estimate the temperature and flow speed of the low energy ions in the plume, and characterize the structure of the plume ionosphere. We find that the plume is highly structured, down to the 2-s (17 km along track) limit of the instrument's sampling. Distinct regions of cold, dense ions, resembling a collisional ionosphere, are intermixed with a broad background of warmer, non-thermal ions, possibly resulting from charge exchange between magnetospheric ions and plume neutrals. Despite the sensor's lack of intrinsic angular resolution, the ion flux and energy spectra are consistent with a drift velocity away from Saturn and in the direction of the upstream flow. References: [1] Tokar et al., 2009, Cassini detection of Enceladus' cold water-group plume ionosphere

  17. Detection of Silver Nanoparticles inside Marine Diatom Thalassiosira pseudonana by Electron Microscopy and Focused Ion Beam

    PubMed Central

    Pascual García, César; Burchardt, Alina D.; Carvalho, Raquel N.; Gilliland, Douglas; C. António, Diana; Rossi, François; Lettieri, Teresa

    2014-01-01

    In the following article an electron/ion microscopy study will be presented which investigates the uptake of silver nanoparticles (AgNPs) by the marine diatom Thalassiosira pseudonana, a primary producer aquatic species. This organism has a characteristic silica exoskeleton that may represent a barrier for the uptake of some chemical pollutants, including nanoparticles (NPs), but that presents a technical challenge when attempting to use electron-microscopy (EM) methods to study NP uptake. Here we present a convenient method to detect the NPs interacting with the diatom cell. It is based on a fixation procedure involving critical point drying which, without prior slicing of the cell, allows its inspection using transmission electron microscopy. Employing a combination of electron and ion microscopy techniques to selectively cut the cell where the NPs were detected, we are able to demonstrate and visualize for the first time the presence of AgNPs inside the cell membrane. PMID:24797958

  18. Development of a low energy ion source for ROSINA ion mode calibration

    SciTech Connect

    Rubin, Martin; Altwegg, Kathrin; Jaeckel, Annette; Balsiger, Hans

    2006-10-15

    The European Rosetta mission on its way to comet 67P/Churyumov-Gerasimenko will remain for more than a year in the close vicinity (1 km) of the comet. The two ROSINA mass spectrometers on board Rosetta are designed to analyze the neutral and ionized volatile components of the cometary coma. However, the relative velocity between the comet and the spacecraft will be minimal and also the velocity of the outgassing particles is below 1 km/s. This combination leads to very low ion energies in the surrounding plasma of the comet, typically below 20 eV. Additionally, the spacecraft may charge up to a few volts in this environment. In order to simulate such plasma and to calibrate the mass spectrometers, a source for ions with very low energies had to be developed for the use in the laboratory together with the different gases expected at the comet. In this paper we present the design of this ion source and we discuss the physical parameters of the ion beam like sensitivity, energy distribution, and beam shape. Finally, we show the first ion measurements that have been performed together with one of the two mass spectrometers.

  19. A low energy ion source for electron capture spectroscopy

    SciTech Connect

    Tusche, C.; Kirschner, J.

    2014-06-15

    We report on the design of an ion source for the production of single and double charged Helium ions with kinetic energies in the range from 300 eV down to 5 eV. The construction is based on a commercial sputter ion gun equipped with a Wien-filter for mass/charge separation. Retardation of the ions from the ionizer potential (2 keV) takes place completely within the lens system of the sputter gun, without modification of original parts. For 15 eV He{sup +} ions, the design allows for beam currents up to 30 nA, limited by the space charge repulsion in the beam. For He{sup 2+} operation, we obtain a beam current of 320 pA at 30 eV, and 46 pA at 5 eV beam energy, respectively. In addition, operating parameters can be optimized for a significant contribution of metastable He*{sup +} (2s) ions.

  20. Modeling Atmospheric Energy Deposition (by energetic ions)

    NASA Astrophysics Data System (ADS)

    Parkinson, C. D.; Brain, D. A.; Lillis, R. J.; Liemohn, M. W.; Bougher, S. W.

    2011-12-01

    The structure, dynamics, chemistry, and evolution of planetary upper atmospheres are in large part determined by the available sources of energy. In addition to the solar EUV flux, the solar wind and solar energetic particle (SEP) events are also important sources. Both of these particle populations can significantly affect an atmosphere, causing atmospheric loss and driving chemical reactions. Attention has been paid to these sources from the standpoint of the radiation environment for humans and electronics, but little work has been done to evaluate their impact on planetary atmospheres. At unmagnetized planets or those with crustal field anomalies, in particular, the solar wind and SEPs of all energies have direct access to the atmosphere and so provide a more substantial energy source than at planets having protective global magnetic fields. Additionally, solar wind and energetic particle fluxes should be more significant for planets orbiting more active stars, such as is the case in the early history of the solar system for paleo-Venus and Mars. Therefore quantification of the atmospheric energy input from the solar wind and SEP events is an important component of our understanding of the processes that control their state and evolution. Such modeling has been previously done for Earth, Mars and Jupiter using a guiding center precipitation model with extensive collisional physics. Currently, this code is only valid for particles with small gyroradii in strong uniform magnetic fields. There is a clear necessity for a Lorentz formulation that can perform calculations for cases where there is only a weak or nonexistent magnetic field that includes detailed physical interaction with the atmosphere (i.e. collisional physics). We show initial efforts to apply a full Lorentz motion particle transport model to study the effects of particle precipitation in the upper atmospheres of Venus, Mars, and Titan. A systematic study of the ionization, excitation, and energy

  1. Neutral dynamics and ion energy transport in MST plasma

    NASA Astrophysics Data System (ADS)

    Xing, Zichuan; Nornberg, Mark; den Hartog, Daniel; Kumar, Santosh; Anderson, Jay

    2015-11-01

    Neutral dynamics can have a significant effect on ion energy transport through charge exchange collisions. Whereas previously charge exchange was considered a direct loss mechanism in MST plasmas, new analysis indicates that significant thermal charge exchange neutrals are reionized. Further, the temperatures of the neutral species in the core of the plasma are suspected to be much higher than room temperature, which has a large effect on ion energy losses due to charge exchange. The DEGAS2 Monte Carlo simulation code is applied to the MST reversed field pinch experiment to estimate the density and temperature profile of the neutral species. The result is then used to further examine the effect of the neutral species on ion energy transport in improved confinement plasmas. This enables the development of a model that accounts for collisional equilibration between species, classical convective and conductive energy transport, and energy loss due to charge exchange collisions. The goal is to quantify classical, stochastic, and anomalous ion heating and transport in RFP plasmas. Work supported by the US DOE. DEGAS2 is provided by PPPL and STRAHL is provided by Ralph Dux of the Max-Planck-Institut fur Plasmaphysik.

  2. ULTRA-LOW-ENERGY HIGH-CURRENT ION SOURCE

    SciTech Connect

    Anders, Andre; Yushkov, Georgy Yu.; Baldwin, David A.

    2009-11-20

    The technical objective of the project was to develop an ultra-low-energy, high-intensity ion source (ULEHIIS) for materials processing in high-technology fields including semiconductors, micro-magnetics and optics/opto-electronics. In its primary application, this ion source can be incorporated into the 4Wave thin-film deposition technique called biased target ion-beam deposition (BTIBD), which is a deposition technique based on sputtering (without magnetic field, i.e., not the typical magnetron sputtering). It is a technological challenge because the laws of space charge limited current (Child-Langmuir) set strict limits of how much current can be extracted from a reservoir of ions, such as a suitable discharge plasma. The solution to the problem was an innovative dual-discharge system without the use of extraction grids.

  3. Oxidation of nickel surfaces by low energy ion bombardment

    NASA Astrophysics Data System (ADS)

    Saric, Iva; Peter, Robert; Kavre, Ivna; Badovinac, Ivana Jelovica; Petravic, Mladen

    2016-03-01

    We have studied formation of oxides on Ni surfaces by low energy oxygen bombardment using X-ray photoemission spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). Different oxidation states of Ni ions have been identified in XPS spectra measured around Ni 2p and O 1s core-levels. We have compared our results with thermal oxidation of Ni and shown that ion bombardment is more efficient in creating thin oxide films on Ni surfaces. The dominant Ni-oxide in both oxidation processes is NiO (Ni2+ oxidation state), while some Ni2O3 contributions (Ni3+ oxidation state) are still present in all oxidised samples. The oxide thickness of bombarded Ni samples, as determined by SIMS, was shown to be related to the penetration depth of oxygen ions in Ni.

  4. Design and Simulation Studies of a One-tenth Scale Final Focus System for Heavy Ion Fussion

    NASA Astrophysics Data System (ADS)

    Wu, X.; York, R. C.; Bangerter, R.; Faltens, A.; Fawley, W.; Judd, D.; Lee, E.

    1997-05-01

    A scaled test of a final focus lattice for Heavy Ion Fusion (HIF) is planned at LBNL. The test parameters were set by scaling the length dimensions of the envelope equation by one tenth while maintaining the generalized perveance. The values to be scaled were taken in large part to be those of the HIBALL-II final focus system.(H. Wollnik, KfK-3840, Kernforschungszentrum Karlsruhe, 1985) The planned experimental system will focus a 120 keV Cs^+ beam to a scaled radial spot size of 0.25 mm. Tracking studies of the tenth-scale system have been performed at NSCL using a version of COSY INIFINITY(M. Berz, MSUCL-977, Michigan State University, 1995) modified to include a linear space charge force. A description of the planned experimental system, the beam parameters, and simulation results will be presented.

  5. Studies on X-ray and Ion Emission from Dense Plasma Focus and Its Application in Material Modification

    NASA Astrophysics Data System (ADS)

    Bhuyan, Heman

    In the recent years, the radiations, namely X-rays and ions, from high temperature and high density plasma have become extremely important because of their applications in diverse areas. In micro- and nano-electronics industries, the current predominant trend of shrinkage of integrated circuits demands powerful, clean and bright pulsed X-ray sources. These sources are in hunt for not only electronics industries but also for other disciplines like micro-radiography, microscopy, crystallography etc.. Likewise, the quest for plasma based ion sources has been growing phenomenally during last decades for the synthesis of novel materials. These novel materials have plenty of applications in automotive, aerospace, biomedical and electronics industries. The need of present hour is to develop compact, cost-effective and efficient plasma based radiation sources so as to fulfill industrial requirements. The work presented in this thesis mainly focuses on how to operate the Dense Plasma Focus facility of Centre of Plasma Physics (CPP DPF) in an enhanced X-ray and ion emission mode. Four research problems are addressed in this thesis: (i) study of current sheet dynamics; (ii) investigation of X-ray emission; (iii) analysis of ion emission; and (iv) utilization of ions for material modification. Salient features of the different chapters of this thesis are described hereafter. Chapter 1, in addition to a brief introduction to the importance of plasma physics, provides information on X-ray and ion sources and their current scenario of industrial applications. Besides, this chapter provides a short introduction to DPF device along with current sheet dynamics and other related plasma phenomena. Chapter 2 presents the design and fabrication details of CPP DPF facility (pulsed power driver, plasma focus tube with pumping system) along with the basic diagnostic techniques (Rogowski coil and resistive voltage divider). In addition, the discharge performance of DPF facility, which is

  6. Heavy Ion Inertial Fusion Energy: Summaries of Program Elements

    SciTech Connect

    Friedman, A; Barnard, J J; Kaganovich, I; Seidl, P A; Briggs, R J; Faltens, A; Kwan, J W; Lee, E P; Logan, B G

    2011-02-28

    The goal of the Heavy Ion Fusion (HIF) Program is to apply high-current accelerator technology to IFE power production. Ion beams of mass {approx}100 amu and kinetic energy {>=} 1 GeV provide efficient energy coupling into matter, and HIF enjoys R&D-supported favorable attributes of: (1) the driver, projected to be robust and efficient; see 'Heavy Ion Accelerator Drivers.'; (2) the targets, which span a continuum from full direct to full indirect drive (and perhaps fast ignition), and have metal exteriors that enable injection at {approx}10 Hz; see 'IFE Target Designs'; (3) the near-classical ion energy deposition in the targets; see 'Beam-Plasma Interactions'; (4) the magnetic final lens, robust against damage; see 'Final Optics-Heavy Ion Beams'; and (5) the fusion chamber, which may use neutronically-thick liquids; see 'Liquid-Wall Chambers.' Most studies of HIF power plants have assumed indirect drive and thick liquid wall protection, but other options are possible.

  7. Application of Ion Mobility Spectrometry (IMS) in forensic chemistry and toxicology with focus on biological matrices

    NASA Technical Reports Server (NTRS)

    Bernhard, Werner; Keller, Thomas; Regenscheit, Priska

    1995-01-01

    The IMS (Ion Mobility Spectroscopy) instrument 'Ionscan' takes advantage of the fact that trace quantities of illicit drugs are adsorbed on dust particles on clothes, in cars and on other items of evidence. The dust particles are collected on a membrane filter by a special attachment on a vacuum cleaner. The sample is then directly inserted into the spectrometer and can be analyzed immediately. We show casework applications of a forensic chemistry and toxicology laboratory. One new application of IMS in forensic chemistry is the detection of psilocybin in dried mushrooms without any further sample preparation.

  8. Low energy ion beam induced changes in ETFE polymer

    NASA Astrophysics Data System (ADS)

    Parada, M. A.; Delalez, N.; de Almeida, A.; Muntele, C.; Muntele, I.; Ila, D.

    2006-01-01

    Low energy ion beam bombardment of ethylenetetrafluoroethylene (ETFE) modifies the physical and chemical properties of the polymer surface in ways that enhance or compromise applications in the technological and medical physics fields. When a material is exposed to ionizing radiation, its changes depends on the type, energy and intensity of the applied radiation. In order to determine the nature of the induced radiation changes, ETFE films were bombarded with fluences from 1012 up to 1015 ions/cm2 of keV N and protons. The emission of gaseous species during the bombardments was monitored with a residual gas analyser (RGA). The bombarded films were analysed with optical absorption photospectrometry (OAP), Fourier transform infrared (FTIR) and micro-Raman spectrometries that determine the chemical nature of the structural changes caused by ions bombardment.

  9. Designing Neutralized Drift Compression for Focusing of Intense Ion Beam Pulses in a Background Plasma

    SciTech Connect

    Kaganovich, I.D.; Davidson, R.C.; Dorf, M.; Startsev, E.A.; Barnard, J.J.; Friedman, A.; Lee, E.P.; Lidia, S.M.; Logan, B.G.; Roy, P.K.; Seidl, P.A.; Welch, D.R.; Sefkow, A.B.

    2009-04-28

    Neutralized drift compression offers an effective method for particle beam focusing and current amplification. In neutralized drift compression, a linear radial and longitudinal velocity drift is applied to a beam pulse, so that the beam pulse compresses as it drifts in the drift-compression section. The beam intensity can increase more than a factor of 100 in both the radial and longitudinal directions, resulting in more than 10,000 times increase in the beam number density during this process. The self-electric and self-magnetic fields can prevent tight ballistic focusing and have to be neutralized by supplying neutralizing electrons. This paper presents a survey of the present theoretical understanding of the drift compression process and plasma neutralization of intense particle beams. The optimal configuration of focusing and neutralizing elements is discussed in this paper.

  10. Formation of ions by high-energy photons

    SciTech Connect

    Drukarev, E. G.; Mikhailov, A. I.; Mikhailov, I. A.; Rakhimov, Kh. Yu.; Scheid, W.

    2007-03-15

    We calculate the electron energy spectrum of ionization by a high-energy photon, accompanied by creation of an e{sup -}e{sup +} pair. The total cross section of the process is also obtained. The asymptotics of the cross section does not depend on the photon energy. At the photon energies exceeding a certain value {omega}{sub 0} this appears to be the dominant mechanism of formation of the ions. The dependence of {omega}{sub 0} on the value of nuclear charge is obtained. Our results are consistent with experimental data.

  11. Predictions for the energy loss of light ions in laser-generated plasmas at low and medium velocities.

    PubMed

    Cayzac, W; Bagnoud, V; Basko, M M; Blažević, A; Frank, A; Gericke, D O; Hallo, L; Malka, G; Ortner, A; Tauschwitz, An; Vorberger, J; Roth, M

    2015-11-01

    The energy loss of light ions in dense plasmas is investigated with special focus on low to medium projectile energies, i.e., at velocities where the maximum of the stopping power occurs. In this region, exceptionally large theoretical uncertainties remain and no conclusive experimental data are available. We perform simulations of beam-plasma configurations well suited for an experimental test of ion energy loss in highly ionized, laser-generated carbon plasmas. The plasma parameters are extracted from two-dimensional hydrodynamic simulations, and a Monte Carlo calculation of the charge-state distribution of the projectile ion beam determines the dynamics of the ion charge state over the whole plasma profile. We show that the discrepancies in the energy loss predicted by different theoretical models are as high as 20-30%, making these theories well distinguishable in suitable experiments.

  12. Photon and dilepton production in high energy heavy ion collisions

    DOE PAGES

    Sakaguchi, Takao

    2015-05-07

    The recent results on direct photons and dileptons in high energy heavy ion collisions, obtained particularly at RHIC and LHC are reviewed. The results are new not only in terms of the probes, but also in terms of the precision. We shall discuss the physics learned from the results.

  13. Characteristics of low energy ions in the Heavy Ions In Space (HIIS) experiment

    NASA Technical Reports Server (NTRS)

    Kleis, Thomas; Tylka, Allan J.; Boberg, Paul R.; Adams, James H., Jr.; Beahm, Lorraine P.

    1995-01-01

    We present preliminary data on heavy ions (Z greater than or equal to 10) detected in the topmost Lexan sheets of the track detector stacks of the Heavy Ions in space (HIIS) experiment (M0001) on LDEF. The energy interval covered by these observations varies with the element, with (for example) Ne observable at 18-100 MeV nuc and Fe at 45-200 MeV/nuc. All of the observed ions are at energies far below the geomagnetic cutoff for fully-ionized particles at the LDEF orbit. Above 50 MeV/nuc (where most of our observed particles are Fe), the ions arrive primarily from the direction of lowest geomagnetic cutoff. This suggests that these particles originate outside the magnetosphere from a source with a steeply-falling spectrum and may therefore be associated with solar energetic particle (SEP) events. Below 50 MeV/nuc, the distribution of arrival directions suggests that most of the observed heavy ions are trapped in the Earth's magnetic field. Preliminary analysis, however, shows that these trapped heavy ions have a very surprising composition: they include not only Ne and Ar, which are expected from the trapping of anomalous cosmic rays (ACR's), but also Mg and Si, which are not part of the anomalous component. Our preliminary analysis shows that trapped heavy ions at 12 less than or equal to Zeta less than or equal to 14 have a steeply-falling spectrum, similar to that reported by the Kiel experiment (exp 1,2,3) on LDEF (M0002) for trapped Ar and Fe at E less than 50 MeV/nuc. The trapped Mg, Si, and Fe may also be associated with SEP events, but the mechanism by which they have appeared to deep in the inner magnetosphere requires further theoretical investigation.

  14. Reduced electrical impedance of SiO{sub 2}, deposited through focused ion beam based systems, due to impurity percolation

    SciTech Connect

    Faraby, H.; DiBattista, M.; Bandaru, P. R.

    2014-11-28

    The electrical impedance (both the resistive and capacitive aspects) of focused ion beam (FIB) deposited SiO{sub 2} has been correlated to the specific composition of the ion beam, in Ga- and Xe-based FIB systems. The presence of electrically percolating Ga in concert with carbon (inevitably found as the product of the hydrocarbon precursor decomposition) has been isolated as a major cause for the observed decrease in the resistivity of the deposited SiO{sub 2}. Concomitant with the decreased resistivity, an increased capacitance and effective dielectric constant was observed. Our study would be useful to understand the constraints to the deposition of high quality insulator films through FIB based methodologies.

  15. Interdigitated 50 nm Ti electrode arrays fabricated using XeF2 enhanced focused ion beam etching

    NASA Astrophysics Data System (ADS)

    Santschi, Ch; Jenke, M.; Hoffmann, P.; Brugger, J.

    2006-06-01

    The fabrication of interdigitated titanium nanoelectrode arrays of 50 nm in width and spacing is described in this work. The nanoarrays have been realized using a Ga+ focused ion beam (FIB). FIB milling is typically accompanied by redeposition of removed material, which represents an important hindrance for milling closely spaced nanostructures. Redeposition effects have been reduced by means of XeF2 gas assistance, which increases the etch yield by a factor of seven compared with pure ion milling. Furthermore, we used a simple adsorption model, which led to the conclusion that dwell time and refresh time should be <500 ns and >30 ms, respectively, for optimized XeF2 assisted Ti milling. The measured resistance R of the electrodes is higher than 1 GΩ.

  16. Focused ion beam/scanning electron microscopy studies of Porcellio scaber (Isopoda, Crustacea) digestive gland epithelium cells.

    PubMed

    Drobne, Damjana; Milani, Marziale; Zrimec, Alexis; Zrimec, Maja Berden; Tatti, Francesco; Draslar, Kazimir

    2005-01-01

    The focused ion beam (FIB) was used to prepare cross sections of precisely selected regions of the digestive gland epithelium of a terrestrial isopod P. scaber (Isopoda, Crustacea) for scanning electron microscopy (SEM). The FIB/SEM system allows ad libitum selection of a region for gross morphologic to ultrastructural investigation, as the repetition of FIB/SEM operations is unrestricted. The milling parameters used in our work proved to be satisfactory to produce serial two-dimensional (2-D) cuts and/or three-dimensional (3-D) shapes on a submicrometer scale. A final, cleaning mill at lower ion currents was employed to minimize the milling artifacts. After cleaning, the milled surface was free of filament- and ridge-like milling artifacts. No other effects of the cleaning mill were observed.

  17. Control of domain wall pinning by localised focused Ga {sup +} ion irradiation on Au capped NiFe nanowires

    SciTech Connect

    Burn, D. M. Atkinson, D.

    2014-10-28

    Understanding domain wall pinning and propagation in nanowires are important for future spintronics and nanoparticle manipulation technologies. Here, the effects of microscopic local modification of the magnetic properties, induced by focused-ion-beam intermixing, in NiFe/Au bilayer nanowires on the pinning behavior of domain walls was investigated. The effects of irradiation dose and the length of the irradiated features were investigated experimentally. The results are considered in the context of detailed quasi-static micromagnetic simulations, where the ion-induced modification was represented as a local reduction of the saturation magnetization. Simulations show that domain wall pinning behavior depends on the magnitude of the magnetization change, the length of the modified region, and the domain wall structure. Comparative analysis indicates that reduced saturation magnetisation is not solely responsible for the experimentally observed pinning behavior.

  18. Cesium removal from liquid acidic wastes with the primary focus on ammonium molybdophosphate as an ion exchanger: A literature review

    SciTech Connect

    Miller, C.J.

    1995-03-01

    Many articles have been written concerning the selective removal of cesium from both acidic and alkaline defense wastes. The majority of the work performed for cesium removal from defense wastes involves alkaline feed solutions. Several different techniques for cesium removal from acidic solutions have been evaluated such as precipitation, solvent extraction, and ion exchange. The purpose of this paper is to briefly review various techniques for cesium removal from acidic solutions. The main focus of the review will be on ion exchange techniques, particularly those involving ammonium molybdophosphate as the exchanger. The pertinent literature sources are condensed into a single document for quick reference. The information contained in this document was used as an aid in determining techniques to evaluate cesium removal from the acidic Idaho Chemical Processing Plant waste matrices. 47 refs., 2 tabs.

  19. Ion and neutral energy distributions in multifrequency capacitive discharges

    NASA Astrophysics Data System (ADS)

    Wu, Alan Chung Fai

    In radio frequency capacitive discharges, ions are accelerated by the electric field in the sheath. During this acceleration, ions can collide with neutrals via charge exchange to create fast neutrals. The particles can then impact the wall with a distribution of energies and angles depending on the power source, gas constituents, pressure, and other reactor parameters. The distributions are important for materials processing, and therefore fast computation models to predict and control these are valuable. An ideal model consists of a series of simple computational steps that result in accurate ion energy, ion angle, neutral energy, and neutral angle distributions (IED, IAD, NED, and NAD, respectively) at the wall given the input parameters. In addition, it predicts the input driving signals needed to give particular distributions. This dissertation covers three parts of this ideal model, which are developed and validated using one dimensional particle-in-cell (PIC) simulations. The first topic deals with predicting the collisionless IED. This assumption is appropriate where the mean free path of the ions is large compared to the sheath width. The model gives the IED given the sheath voltage obtained from PIC simulations. The second topic deals with a synthesis process to estimate the input parameters needed for a uniform IED in a collisionless regime. A cumulative distribution function of the IED is used to determine the simplest ion response, which is then chosen as the driving voltage. Then the steps in the first topic are applied and compared to the results. The last topic deals with IED, IAD, NED, and NAD from PIC in a collisional regime. At higher pressures, the mean free path of the ions is not large compared to the sheath width. Therefore, the ions will collide with the background gas as they accelerate across the sheath. As a result, there will be fewer energetic ions. In addition, fast neutral particles created by charge exchange and elastic scattering

  20. Ion beam extraction from electron cyclotron resonance ion sources and the subsequent low energy beam transport

    NASA Astrophysics Data System (ADS)

    Winklehner, Daniel

    Electron Cyclotron Resonance Ion Sources (ECRIS) are capable of delivering high currents of Highly Charged Ions (HCIs) to heavy ion accelerators (e.g.: to the future FRIB). The use of a sextupole magnet for confinement of the plasma inside the source imposes a unique triangular structure on the beam. This, together with the multitude of ion species that are extracted at the same time and the high axial magnetic field at the plasma aperture, resulting from additional confining solenoids, make the simulation and design of ECRIS extraction systems particularly challenging. The first objective of this thesis was to refine and test a semi-empirical simulation model of the formation and extraction of HCIs from ECR ion sources as well as their transport through the subsequent Low Energy Beam Transport (LEBT) system. To this end, a set of utility functions was written to simplify performing the simulations. In the LEBT system, another interesting, yet so far unanswered, question arises: The influence of space-charge effects on the beam and the level of space-charge compensation in the ECRIS beam line. This interesting topic quickly became the second main objective of the thesis. A Retarding Field Analyzer (RFA) was built and systematic measurements of the neutralization level in ECRIS LEBT systems were done for the first time as part of this thesis (this intensity and pressure regime was previously not well explored). The measured neutralization levels for typical ECRIS beams were found to be between 0% and 50% and agreed reasonably well with a simple formula developed by Gabovich et al. for highly neutralized proton and H- beams after it was re-derived and extended in this thesis for low neutralization and multiple species. Preliminary tests of the refined and integrated simulation model for the ECR ion sources VENUS and SuSI and their respective low energy beam transport systems include comparisons of measured beam currents, cross sections and emittances with the

  1. Surface modification produced by a nitrogen operated plasma focus device: the role of the ion beam in the heating of a substrate

    NASA Astrophysics Data System (ADS)

    Lepone, A.; Kelly, H.; Lamas, D.; Márquez, A.

    1999-04-01

    The role of the nitrogen ion beam generated with a small energy plasma focus (PF) device in the thermal processing of an austenitic stainless steel substrate is discussed. A numerical solution of the heat equation which takes into account the temperature variations of the thermal coefficients of the material is presented. By using several characteristics of the beam determined in previous works, it is found that the energy content of the beam is not enough to promote a strong heating of the outer layers of the substrate, which is required to explain the introduction of foreign particles to depths well beyond the ion range in the material, and also the martensitic transformation of steel up to a depth of ≈0.6 μm found in this work. The surface treatment is thus attributed to a plasma bubble generated by the disruption of the plasma column, and some evidence of its presence is obtained by employing a Faraday cup (FC). When the numerical model is used with an input energy density corresponding to the experimental value, and with a delivery time equal to the temporal width of the bubble, the evolution of the temperature profiles along the substrate depth shows a melting front reaching the proper depth to explain the penetration of Ti and N atoms found in a previous work, and the martensitic transformation depth presented in this work.

  2. Fabrication of novel quantum cascade lasers using focused ion beam (FIB) processing

    NASA Astrophysics Data System (ADS)

    Ross, I. M.; Ng, W. H.; Wilson, L. R.; Luxmoore, I. J.; Cockburn, J. W.; Krysa, A.; Cullis, A. G.; Roberts, J. S.

    2006-02-01

    Focussed ion beam (FIB) processing has been applied to the fabrication of novel InP-based cleaved coupled cavity (CCC) quantum cascade lasers (QCL). Gas assisted etching using XeF2 has been shown to significantly reduce the redeposition of sputtered material onto the mirror surfaces during final milling. For the unprocessed laser a broad spread of lasing peaks are observed between 9.72µm to 9.78µm at a current of 380mA (1kA/cm-2). After FIB processing, substantial side mode suppression is observed on applying a current of 20mA (100A/cm-2) to the short section and the main lasing peak is observed at 9.77µm.

  3. Translational strategies for neuroprotection in ischemic stroke - focusing on Acid Sensing Ion Channel 1a

    PubMed Central

    O'Bryant, Zaven; Vann, Kiara T.; Xiong, Zhi-Gang

    2014-01-01

    Ischemic stroke contributes to the majority of brain injuries and remains to be a leading cause of death and long-term disability. Despite the devastating pathology and high incidence of disease, there remain only few treatment options (tPA and endovascular procedures), which may be hampered by time dependent administration among a variety of other factors. Promising research of glutamate receptor antagonists has been unsuccessful in clinical trial. But, the mechanism by which glutamate receptors initiate injury by excessive calcium overload has spurred investigation of new and potentially successful candidates for stroke therapy. Acid sensing ion channels (ASICs) may contribute to poor stroke prognosis due to localized drop in brain pH, resulting in excessive calcium overload, independent of glutamate activation. Accumulating studies targeting ASICs have underscored the importance of understanding inhibition, regulation, desensitization and trafficking of this channel and its role in disease. This review will discuss potential directions in translational ASIC research for future stroke therapies. PMID:24390970

  4. Cryogenic helium as stopping medium for high-energy ions

    NASA Astrophysics Data System (ADS)

    Purushothaman, S.; Dendooven, P.; Moore, I.; Penttilä, H.; Ronkainen, J.; Saastamoinen, A.; Äystö, J.; Peräjärvi, K.; Takahashi, N.; Gloos, K.

    2008-10-01

    We have investigated the survival and transport efficiency of 219Rn ions emitted by a 223Ra source in high-density cryogenic helium gas, with ionisation of the gas induced by a proton beam. The combined efficiency of ion survival and transport by an applied electric field was measured as a function of ionisation rate density for electric fields up to 160 V/cm and for three temperature and density combinations: 77 K, 0.18 mg/cm3, 10 K, 0.18 mg/cm3 and 10 K, 0.54 mg/cm3. At low beam intensity or high electric field, an efficiency of 30 % is obtained, confirming earlier results. A sharp drop in efficiency is observed at a "threshold" ionisation rate density which increases with the square of the applied electric field. At 160 V/cm, the efficiency stays above 10% up to an ionisation rate density of 1012 ion-electron pairs/cm3/s. The observed behaviour is understood as the result of shielding of the applied field by the weak plasma created by the proton beam: it counteracts the effective transport of ions and electrons, leading to recombination between the two. We conclude that cryogenic helium gas at high-density and high electric field is a promising medium for the transformation of very high-energy ions into low-energy ones.

  5. Studies on heavy ion fusion and high energy density physics in Japan

    NASA Astrophysics Data System (ADS)

    Kawata, S.; Horioka, K.; Murakami, M.; Oguri, Y.; Hasegawa, J.; Takayama, K.; Yoneda, H.; Miyazawa, K.; Someya, T.; Ogoyski, A. I.; Seino, M.; Kikuchi, T.; Kawamura, T.; Ogawa, M.

    2007-07-01

    In this paper, significant progresses of Japanese research activities are presented in heavy ion fusion (HIF) and high energy density physics (HEDP). Heavy ion beam (HIB) is a prominent tool to study HEDP and HIF, and HIBs may be a promising inertial fusion driver. HIB accelerators have been studied intensively for a long time; HIB pulse profile, a particle energy and a HIB quality are controllable. A HIB energy deposition profile is also well defined, and HIB energy is deposited inside a material. By focusing and using the HIB excellent properties, Japanese HIF and HEDP activities have covered a wide variety of subjects ranging from new accelerators to future HIF studies: ion source, new inductive accelerator, beam physics, beam bunching, beam instabilities, HIB interactions with gas or materials, laser ion acceleration, HIB transport, HIB-based warm dense (WD) state generation, new measurement of HED or WD matters, HIB stopping power, atomic physics, multi-HIBs illumination on a target, HIF target implosion, impact ignition scheme, HIB-radiation conversion, radiation confinement and transport in HED matter or in HIF, and so on.

  6. Energy loss of heavy ions at high velocity

    NASA Astrophysics Data System (ADS)

    Andersen, J. U.; Ball, G. C.; Davies, J. A.; Davies, W. G.; Forster, J. S.; Geiger, J. S.; Geissel, H.; Ryabov, V. A.

    1994-05-01

    The slowing down of heavy ions by electronic stopping at high velocity is discussed. The ions are nearly fully stripped and have a well defined charge with relatively small fluctuations. Owing to the large charge of the ions, the classical Bohr formula applies instead of the Bethe formula, which is based on a quantum perturbation calculation. It is essential to include the Barkas effect in the description since it becomes quite large for heavy ions, especially in high-Z materials. In Lindhard's treatment [Nucl. Instr. and Meth. 132 (1976) l], the Barkas correction is viewed as an effect of dynamic screening of the ion potential in the initial phase of a collision with an electron, which reduces the relative velocity and therefore enhances the cross section. With inclusion of this enhancement factor for all impact parameters, as evaluated by Jackson and McCarthy for distant collisions [Phys. Rev. B 6 (1972) 4131], the description reproduces within a few percent measurements for 15 MeV/u Br on Si, Ni, and Au and for 10 MeV/u Kr on Al, Ni, and Au. The procedure is shown also to apply at lower velocities near the stopping maximum, albeit with less accuracy. The straggling in energy loss has been analyzed for a measurement on Si and it is well described by a combination of about equal contributions from fluctuations in the number of violent collisions with single electrons (Bohr straggling) and from fluctuations in ion charge state.

  7. Modeling heavy ion ionization energy loss at low and intermediate energies

    SciTech Connect

    Rakhno, I.L.; /Fermilab

    2009-11-01

    The needs of contemporary accelerator and space projects led to significant efforts made to include description of heavy ion interactions with matter in general-purpose Monte Carlo codes. This paper deals with an updated model of heavy ion ionization energy loss developed previously for the MARS code. The model agrees well with experimental data for various projectiles and targets including super-heavy ions in low-Z media.

  8. Ion energy distributions and densities in the plume of Enceladus

    NASA Astrophysics Data System (ADS)

    Sakai, Shotaro; Cravens, Thomas E.; Omidi, Nojan; Perry, Mark E.; Waite, J. Hunter

    2016-10-01

    Enceladus has a dynamic plume that is emitting gas, including water vapor, and dust. The gas is ionized by solar EUV radiation, charge exchange, and electron impact and extends throughout the inner magnetosphere of Saturn. The charge exchange collisions alter the plasma composition. Ice grains (dust) escape from the vicinity of Enceladus and form the E ring, including a portion that is negatively charged by the local plasma. The inner magnetosphere within 10 RS (Saturn radii) contains a complex mixture of plasma, neutral gas, and dust that links back to Enceladus. In this paper we investigate the energy distributions, ion species and densities of water group ions in the plume of Enceladus using test particle and Monte Carlo methods that include collisional processes such as charge exchange and ion-neutral chemical reactions. Ion observations from the Cassini Ion and Neutral Mass Spectrometer (INMS) for E07 are presented for the first time. We use the modeling results to interpret observations made by the Cassini Plasma Spectrometer (CAPS) and the INMS. The low energy ions, as observed by CAPS, appear to be affected by a vertical electric field (EZ=-10 μV/m) in the plume. The EZ field may be associated with the charged dust and/or the pressure gradient of plasma. The model results, along with the results of earlier models, show that H3O+ ions created by chemistry are predominant in the plume, which agrees with INMS and CAPS data, but the INMS count rate in the plume for the model is several times greater than the data, which we do not fully understand. This composition and the total ion count found in the plume agree with INMS and CAPS data. On the other hand, the Cassini Langmuir Probe measured a maximum plume ion density more than 30,000 cm-3, which is far larger than the maximum ion density from our model, 900 cm-3. The model results also demonstrate that most of the ions in the plume are from the external magnetospheric flow and are not generated by local

  9. Thermal treatment-induced ductile-to-brittle transition of submicron-sized Si pillars fabricated by focused ion beam

    SciTech Connect

    Wang, Yue-cun; Xie, De-gang; Ning, Xiao-hui; Shan, Zhi-wei

    2015-02-23

    Si pillars fabricated by focused ion beam (FIB) had been reported to have a critical size of 310–400 nm, below which their deformation behavior would experience a brittle-to-ductile transition at room temperature. Here, we demonstrated that the size-dependent transition was actually stemmed from the amorphous Si (a-Si) shell introduced during the FIB fabrication process. Once the a-Si shell was crystallized, Si pillars would behave brittle again with their modulus comparable to their bulk counterpart. The analytical model we developed has been proved to be valid in deriving the moduli of crystalline Si core and a-Si shell.

  10. Design of a post linac for an energy upgrade of a heavy-ion injector

    NASA Astrophysics Data System (ADS)

    Iwata, Y.; Noda, K.

    2014-07-01

    A post linac is being designed for an energy upgrade of a heavy-ion injector. This post linac is to be installed downstream of the formerly developed compact injector, consisting of an Electron-Cyclotron-Resonance Ion-Source (ECRIS), the Radio-Frequency-Quadrupole (RFQ) linac and the Alternating-Phase-Focused Interdigital H-mode Drift-Tube-Linac (APF IH-DTL). It is aimed to increase the output energy of a heavy-ion injector. Carbon ions are initially accelerated with the compact injector to 4 MeV/u, and further accelerated with the post linac up to 8 MeV/u. The three linacs have the same operating frequency of 200 MHz. For beam focusing of the post linac, the APF method is used. Iterative simulations of beam dynamics were performed to determine the optimum array of synchronous phases in each gap. The results of the simulations provided that the calculated efficiency of beam transmission through the post linac is as high as 98.4%. The total length of this APF post linac is estimated to be approximately 3 m. A design overview of the injector system including the post linac is presented.

  11. Previously hidden low-energy ions: a better map of near-Earth space and the terrestrial mass balance

    NASA Astrophysics Data System (ADS)

    André, Mats

    2015-12-01

    This is a review of the mass balance of planet Earth, intended also for scientists not usually working with space physics or geophysics. The discussion includes both outflow of ions and neutrals from the ionosphere and upper atmosphere, and the inflow of meteoroids and larger objects. The focus is on ions with energies less than tens of eV originating from the ionosphere. Positive low-energy ions are complicated to detect onboard sunlit spacecraft at higher altitudes, which often become positively charged to several tens of volts. We have invented a technique to observe low-energy ions based on the detection of the wake behind a charged spacecraft in a supersonic ion flow. We find that low-energy ions usually dominate the ion density and the outward flux in large volumes in the magnetosphere. The global outflow is of the order of 1026 ions s-1. This is a significant fraction of the total number outflow of particles from Earth, and changes plasma processes in near-Earth space. We compare order of magnitude estimates of the mass outflow and inflow for planet Earth and find that they are similar, at around 1 kg s-1 (30 000 ton yr-1). We briefly discuss atmospheric and ionospheric outflow from other planets and the connection to evolution of extraterrestrial life.

  12. High-energy ion processing of materials for improved hardcoatings

    SciTech Connect

    Williams, J.M.; Gorbatkin, S.M.; Rhoades, R.L.; Oliver, W.C.; Riester, L.; Tsui, T.Y.

    1994-02-01

    Research has been directed toward use of economically viable ion processing strategies for production and improvement of hardcoatings. Processing techniques were high-energy ion implantation and electron cyclotron resonance microwave plasma processing. Subject materials were boron suboxides, Ti-6Al-4V alloy, CoCrMo alloy (a Stellite{trademark}), and electroplated Cr. These materials may be regarded either as coatings themselves (which might be deposited by thermal spraying, plasma processing, etc.) or in some cases, as substrates whose surfaces can be improved. hardness and other properties in relation to process variables are reported.

  13. High-voltage variable resistor for ion energy spectroscopy

    SciTech Connect

    Gay, T.J.; Irby, V.D.; Yallaly, S.P. )

    1993-06-01

    A high-voltage variable resistor was designed, built, and implemented to modify an ion-energy spectrometer for the study of ion--atom collisions in which the projectiles change charge. The resistor is remotely switchable from 0 to 2050 M[Omega] and has a voltage rating of 200 kV. The design criteria and the electrical and mechanical details of the apparatus are discussed. The design and construction of an ancillary device, comprising two precision resistive-divider voltmeters, are also discussed.

  14. Investigating the performance of an ion luminescence probe as a multichannel fast-ion energy spectrometer using pulse height analysis

    SciTech Connect

    Zurro, B.; Baciero, A.; Jimenez-Rey, D.; Rodriguez-Barquero, L.; Crespo, M. T.

    2012-10-15

    We investigate the capability of a fast-ion luminescent probe to operate as a pulse height ion energy analyzer. An existing high sensitivity system has been reconfigured as a single channel ion detector with an amplifier to give a bandwidth comparable to the phosphor response time. A digital pulse processing method has been developed to determine pulse heights from the detector signal so as to obtain time-resolved information on the ion energy distribution of the plasma ions lost to the wall of the TJ-II stellarator. Finally, the potential of this approach for magnetic confined fusion plasmas is evaluated by studying representative TJ-II discharges.

  15. Scaling in the correlation energies of atomic ions

    NASA Astrophysics Data System (ADS)

    Odriazola, A.; González, A.; Räsänen, E.

    2014-11-01

    We show through numerical investigations that the ground-state correlation energies of atomic ions follow an unexpectedly simple scaling relation, Ec≈Z4 /3fc(Z /N ) , where N is the number of electrons, Z is the atomic number, and fc is a universal function, for which an analytic expression with a one-parameter fit can be provided. The relation agrees well with several sets of correlation energies obtained from different methods for atomic ions with N =2 ,...,18 and Z =2 ,...,28 . Moreover, our relation gives a good agreement with neutral atoms up to N ≈90 . Our main result is readily applicable to estimating correlation energies of heavy elements, for which there are no available data in the literature. The simplicity of the relation may also have implications in the development of correlation functionals within density-functional theory.

  16. Heavy-ion fission probability calculations at high excitation energy

    SciTech Connect

    D'Arrigo, A.; Giardina, G.; Taccone, A. Istituto Nazionale di Fisica Nucleare, Gruppo Collegato di Messina, Messina Istituto di Tecniche Spettroscopiche del Consiglio Nazionale delle Ricerche, Messina )

    1991-12-01

    In the framework of the statistical theory of nuclear reactions we calculated the fission probability {ital P}{sub {ital f}} of the {sup 153}Tb, {sup 158}Er, {sup 159}Dy, {sup 175}Hf, {sup 179}Ta, {sup 186}Os, and {sup 188}Os nuclei with a mass number {ital A}=150--200 produced by heavy-ion reactions. Starting from the spectra of the single-particle levels as determined by Nix and Moeller, and utilizing a formalism we developed, we determined the excitation energy dependence of the effective level density parameters for the fission and the neutron emission channels. The agreement between the fission probability calculations and the experimental data was reached when a nonadiabatic estimate of the collective effects was used to calculate the nuclear level density. In the fission process at high excitation energies induced by ions heavier than the {alpha} particle, an energy dependence of the effective fission barrier has to be used.

  17. Energy dependence of island nucleation density during ion beam deposition

    NASA Astrophysics Data System (ADS)

    Pomeroy, Joshua M.; Brock, Joel D.

    2002-03-01

    Thin copper films were grown on single crystal copper substrates using highly collimated copper ion beams with precisely controlled incidence energies. The energetic collisions between the copper ions and the surface can form adatom-vacancy pairs or sputter eject atoms into the vaccuum. Island nucleation densities are affected by these atomistic mechanisms, which increase surface adatom densities and surface defect densities. This paper reports STM measurements of the island nucleation density for films grown both thermally and at energies between 10-150 eV. The measured island nucleation density systematically deviates with increasing energy from the density predicted by mean field nucleation theory (J.A. Venables, et.al., Rep. Prog. Phys. 47 (1984) p. 399-459). This deviation can be understood using a phenomenological extension of mean field nucleation theory that includes the effects of adatom-vacancy pair production and sputter ejection on the effective flux.

  18. Appearance energies of C{sub 60} fragment ions revisited

    SciTech Connect

    Matt, S.; Muigg, D.; Ding, A.; Lifshitz, C.; Scheier, P.; Mark, T.D.

    1996-05-23

    Following up on a serious discrepancy (factor of 2) in reported appearance energies for fragment ions produced by electron impact ionization of C{sub 60}, we have measured here the appearance energies as a function of electron current using a crossed beam apparatus dedicated to ionization cross section measurements. Thus, it was possible to conclude that the low-energy peaks in the electron ionization curves of Baba et al. (which have been used to deduce the appearance energies) are very likely caused by consecutive ionization and excitation processes due to the high electron currents employed in these measurements. From this it follows that the true appearance energies are the high appearance energies reported earlier by Maerk and co-workers (and Anderson and co-workers) which were determined at low ionizing electron currents to prevent secondary processes in the ion source. Moreover, we discuss here the crucial role of the kinetic shift in deriving activation energies and other thermochemical properties from measured appearance energies. 25 refs., 5 figs.

  19. Temporal evolution of ion energy distribution functions and ion charge states of Cr and Cr-Al pulsed arc plasmas

    SciTech Connect

    Tanaka, Koichi; Anders, André

    2015-11-15

    To study the temporal evolution of ion energy distribution functions, charge-state-resolved ion energy distribution functions of pulsed arc plasmas from Cr and Cr-Al cathodes were recorded with high time resolution by using direct data acquisition from a combined energy and mass analyzer. The authors find increases in intensities of singly charged ions, which is evidence that charge exchange reactions took place in both Cr and Cr-Al systems. In Cr-Al plasmas, the distributions of high-charge-state ions exhibit high energy tails 50 μs after discharge ignition, but no such tails were observed at 500 μs. The energy ratios of ions of different charge states at the beginning of the pulse, when less neutral atoms were in the space in front of the cathode, suggest that ions are accelerated by an electric field. The situation is not so clear after 50 μs due to particle collisions. The initial mean ion charge state of Cr was about the same in Cr and in Cr-Al plasmas, but it decreased more rapidly in Cr-Al plasmas compared to the decay in Cr plasma. The faster decay of the mean ion charge state and ion energy caused by the addition of Al into a pure Cr cathode suggests that the mean ion charge state is determined not only by ionization processes at the cathode spot but also by inelastic collision between different elements.

  20. Radiation damage studies of soft magnetic metallic glasses irradiated with high-energy heavy ions

    NASA Astrophysics Data System (ADS)

    Pavlovič, Márius; Miglierini, Marcel; Mustafin, Edil; Ensinger, Wolfgang; Šagátová, Andrea; Šoka, Martin

    2015-01-01

    Some soft magnetic metallic glasses are considered for use in magnetic cores of accelerator radio frequency cavities. Due to losses of the circulating ion beam, they may be exposed to irradiation by different ions at different energies. This paper presents data and review results of irradiation experiments concerning the influence of high-energy heavy ions on magnetic susceptibility of VITROPERM®-type metallic glasses. Samples of the VITROPERM® magnetic ribbons were irradiated by Au, Xe and U ions at 11.1 MeV/A (per nucleon) and 5.9 MeV/A, respectively. Irradiation fluences from 1 × 1011 up to 1 × 1013 ions/cm2 were applied. In case of the Au and U ions, the total fluence was accumulated in one beamtime, whereas two separate beamtimes were used to accumulate the final fluence in case of the Xe ions. Relative change in the samples' magnetic susceptibility after and before irradiation was evaluated as a function of the irradiation fluence. The irradiation experiments were performed with the UNILAC accelerator at GSI Helmholtzzentrum für Schwerionenforschung GmbH. They were simulated in SRIM2010 in order to obtain ionization densities (electronic stopping, dE/dx) and dpa (displacements per atom) caused by the ion beams in the sample material. This paper focuses mainly on the results collected in experiments with the Xe ions and compares them with data obtained in earlier experiments using Au and U ions. Radiation hardness of VITROPERM® is compared with radiation hardness of VITROVAC® that was studied in previous experiments. The VITROPERM® samples showed less drop in magnetic susceptibility in comparison with the VITROVAC® ones, and this drop occurred at higher fluences. This indicates higher radiation hardness of VITROPERM® compared with VITROVAC®. In addition, heavier ions cause bigger change in magnetic susceptibility than the lighter ones. The effect can be roughly scaled with electronic stopping, which suggests that the main mechanism of radiation

  1. High-pressure generation using double stage micro-paired diamond anvils shaped by focused ion beam

    SciTech Connect

    Sakai, Takeshi Ohfuji, Hiroaki; Yagi, Takehiko; Irifune, Tetsuo; Ohishi, Yasuo; Hirao, Naohisa; Suzuki, Yuya; Kuroda, Yasushi; Asakawa, Takayuki; Kanemura, Takashi

    2015-03-15

    Micron-sized diamond anvils with a 3 μm culet were successfully processed using a focused ion beam (FIB) system and the generation of high pressures was confirmed using the double stage diamond anvil cell technique. The difficulty of aligning two second-stage micro-anvils was solved via the paired micro-anvil method. Micro-manufacturing using a FIB system enables us to control anvil shape, process any materials, including nano-polycrystalline diamond and single crystal diamond, and assemble the sample exactly in a very small space between the second-stage anvils. This method is highly reproducible. High pressures over 300 GPa were achieved, and the pressure distribution around the micro-anvil culet was evaluated by using a well-focused synchrotron micro-X-ray beam.

  2. Energy gain and spectral tailoring of ion beams using ultra-high intensity laser beams

    NASA Astrophysics Data System (ADS)

    Prasad, Rajendra; Swantusch, Marco; Cerchez, Mirela; Spickermann, Sven; Auorand, Bastian; Wowra, Thomas; Boeker, Juergen; Willi, Oswald

    2015-11-01

    The field of laser driven ion acceleration over the past decade has produced a huge amount of research. Nowadays, several multi-beam facilities with high rep rate system, e.g. ELI, are being developed across the world for different kinds of experiments. The study of interaction dynamics of multiple beams possessing ultra-high intensity and ultra-short pulse duration is of vital importance. Here, we present the first experimental results on ion acceleration using two ultra-high intensity beams. Thanks to the unique capability of Arcturus laser at HHU Düsseldorf, two almost identical, independent beams in laser parameters such as intensity (>1020 W/cm2), pulse duration (30 fs) and contrast (>1010), could be accessed. Both beams are focused onto a 5 μm thin Ti target. While ensuring spatial overlap of the two beams, at relative temporal delay of ~ 50 ps (optimum delay), the proton and carbon ion energies were enhanced by factor of 1.5. Moreover, strong modulation in C4+ions near the high energy cut-off is observed later than the optimum delay for the proton enhancement. This offers controlled tailoring of the spectral content of heavy ions.

  3. Analysis of the degradation induced by focused ion Ga{sup 3+} beam for the realization of piezoelectric nanostructures

    SciTech Connect

    Remiens, D.; Liang, R. H.; Soyer, C.; Deresmes, D.; Troadec, D.; Quignon, S.; Da Costa, A.; Desfeux, R.

    2010-08-15

    Piezoelectric nanostructures (islands of dimensions in the lateral size range 50-500 nm) have been fabricated by focused Ga{sup 3+} ion beam (FIB) etching on PbZr{sub 0.54}Ti{sub 0.46}O{sub 3} thin films obtained by magnetron sputtering. The degradation induced by the etching process is investigated through the evolution of electromechanical activity measured by means of local piezoelectric hysteresis loops produced by piezoresponse force microscopy. The analysis of surface potential is performed by kelvin force microscopy and the measurement of current-voltage curves is carried out by conducting atomic force microscopy. Two kinds of structures, namely one based on crystallized films and the other based on amorphous ones, were studied. In this latter case, the amorphous films are postannealed after etching to obtain crystallized structure. For the structures based on the crystallized and then etched films, no piezoelectric signal was registered that evidences a serious degradation of material induced by Ga{sup 3+} ion implantation. For the structures based on the films etched in amorphous state and then crystallized, the piezoresponse signal was near to that of the reference films (crystallized and not etched) whatever were the ion dose and the island dimensions. Even for very small lateral size (50 nm), no size effect was observed. The island shapes fabricated by Ga{sup 3+} FIB etching process (islands with less than 50 nm lateral size) show a limitation of FIB processing and electron beam lithography seems to be necessary.

  4. Fabrication of micro/nano-structures using focused ion beam implantation and XeF2 gas-assisted etching

    NASA Astrophysics Data System (ADS)

    Xu, Z. W.; Fang, F. Z.; Fu, Y. Q.; Zhang, S. J.; Han, T.; Li, J. M.

    2009-05-01

    A micro/nano-structure fabrication method is developed using focused ion beam implantation (FIBI) and FIB XeF2 gas-assisted etching (FIB-GAE). Firstly, the FIB parameters' influence on the FIBI depth is studied by SEM observation of the FIBI cross-section cutting by FIB. Nanoparticles with 10-15 nm diameter are found to be evenly distributed in the FIBI layer, which can serve as a XeF2-assisted etching mask when the ion dose is larger than 1.4 × 1017 ions cm-2. The FIBI layers being used as the etching mask for the subsequent FIB-GAE process are explored to create different micro/nano-structures such as nano-gratings, nano-electrode and sinusoidal microstructures. It is found that the method of combining FIBI with subsequent FIB-GAE is efficient and flexible in micro/nano-structuring, and it can effectively remove the redeposition effect compared with the FIB milling method.

  5. Niobium nano-SQUIDs based on sub-micron tunnel junction fabricated by three-dimensional Focused Ion Beam sculpting

    NASA Astrophysics Data System (ADS)

    Fretto, M.; Enrico, E.; De Leo, N.; Boarino, L.; Lacquaniti, V.; Granata, C.; Russo, R.; Vettoliere, A.

    2014-05-01

    A three dimensional nano-SQUID (Superconducting Quantum Interference Device) has been realized in a vertical configuration (with the loop in the same plane of Josephson Tunneling Junctions, JTJs). The loop area is 0.25 μm2 corresponding to a modulation period of about 5 mT, the square JTJs have a side length of 0.3 μm. Josephson junction's fabrication is carried out combining optical lithography to pattern trilayer and three dimensional (3D) Focused Ion Beam (FIB) sculpting technique to define the junctions' and the loop's areas. Two different ion etching processes were performed, perpendicular and parallel to the multilayer, resulting in a precise 3D structure. Finally, a standard anodization was performed to eliminate the unstructured surface material generated by the high energetic ion beam assuring high quality junctions. Electric transport characteristics of the nanodevice measured at T = 4.2 K are reported, in particular the current-voltage characteristics and critical current vs external magnetic field. The high modulation depth of the critical current (up to 70% of the Ic at zero magnetic flux) and the device reliability are very encouraging in view of nanoscience applications.

  6. Drift compression and final focus systems for heavy ion inertial fusion

    SciTech Connect

    de Hoon, M.J.L.

    2001-05-01

    Longitudinal compression of space-charge dominated beams can be achieved by imposing a head-to-tail velocity tilt on the beam. This tilt has to be carefully tailored, such that it is removed by the longitudinal space-charge repulsion by the time the beam reaches the end of the drift compression section. The transverse focusing lattice should be designed such that all parts of the beam stay approximately matched, while the beam smoothly expands transversely to the larger beam radius needed in the final focus system following drift compression. In this thesis, several drift compression systems were designed within these constraints, based on a given desired pulse shape at the end of drift compression systems were designed within these constraints, based on a given desired pulse shape at the end of drift compression. The occurrence of mismatches due to a rapidly increasing current was analyzed. In addition, the sensitivity of drift compression to errors in the initial velocity tilt and current profile was studied. These calculations were done using a new computer code that accurately calculates the longitudinal electric field in the space-charge dominated regime.

  7. Diagnostics for ion beam driven high energy density physics experiments

    SciTech Connect

    Bieniosek, F. M.; Henestroza, E.; Lidia, S.; Ni, P. A.

    2010-10-15

    Intense beams of heavy ions are capable of heating volumetric samples of matter to high energy density. Experiments are performed on the resulting warm dense matter (WDM) at the NDCX-I ion beam accelerator. The 0.3 MeV, 30 mA K{sup +} beam from NDCX-I heats foil targets by combined longitudinal and transverse neutralized drift compression of the ion beam. Both the compressed and uncompressed parts of the NDCX-I beam heat targets. The exotic state of matter (WDM) in these experiments requires specialized diagnostic techniques. We have developed a target chamber and fielded target diagnostics including a fast multichannel optical pyrometer, optical streak camera, laser Doppler-shift interferometer (Velocity Interferometer System for Any Reflector), beam transmission diagnostics, and high-speed gated cameras. We also present plans and opportunities for diagnostic development and a new target chamber for NDCX-II.

  8. Diagnostics for ion beam driven high energy density physics experiments.

    PubMed

    Bieniosek, F M; Henestroza, E; Lidia, S; Ni, P A

    2010-10-01

    Intense beams of heavy ions are capable of heating volumetric samples of matter to high energy density. Experiments are performed on the resulting warm dense matter (WDM) at the NDCX-I ion beam accelerator. The 0.3 MeV, 30 mA K(+) beam from NDCX-I heats foil targets by combined longitudinal and transverse neutralized drift compression of the ion beam. Both the compressed and uncompressed parts of the NDCX-I beam heat targets. The exotic state of matter (WDM) in these experiments requires specialized diagnostic techniques. We have developed a target chamber and fielded target diagnostics including a fast multichannel optical pyrometer, optical streak camera, laser Doppler-shift interferometer (Velocity Interferometer System for Any Reflector), beam transmission diagnostics, and high-speed gated cameras. We also present plans and opportunities for diagnostic development and a new target chamber for NDCX-II.

  9. Simulating Intense Ion Beams for Inertial Fusion Energy

    SciTech Connect

    Friedman, A

    2001-02-20

    The Heavy Ion Fusion (HIF) program's goal is the development of the body of knowledge needed for Inertial Fusion Energy (IFE) to realize its promise. The intense ion beams that will drive HIF targets are nonneutral plasmas and exhibit collective, nonlinear dynamics which must be understood using the kinetic models of plasma physics. This beam physics is both rich and subtle: a wide range in spatial and temporal scales is involved, and effects associated with both instabilities and non-ideal processes must be understood. Ion beams have a ''long memory'', and initialization of a beam at mid-system with an idealized particle distribution introduces uncertainties; thus, it will be crucial to develop, and to extensively use, an integrated and detailed ''source-to-target'' HIF beam simulation capability. We begin with an overview of major issues.

  10. Simulating Intense Ion Beams for Inertial Fusion Energy

    SciTech Connect

    Friedman, A.

    2001-02-20

    The Heavy Ion Fusion (HIF) program's goal is the development of the body of knowledge needed for Inertial Fusion Energy (IFE) to realize its promise. The intense ion beams that will drive HIF targets are rzonneutral plasmas and exhibit collective, nonlinear dynamics which must be understood using the kinetic models of plasma physics. This beam physics is both rich and subtle: a wide range in spatial and temporal scales is involved, and effects associated with both instabilities and non-ideal processes must be understood. Ion beams have a ''long memory,'' and initialization of a beam at mid-system with an idealized particle distribution introduces uncertainties; thus, it will be crucial to develop, and to extensively use, an integrated and detailed ''source-to-target'' HIF beam simulation capability. We begin with an overview of major issues.

  11. Diagnostics for ion beam driven high energy density physics experiments.

    PubMed

    Bieniosek, F M; Henestroza, E; Lidia, S; Ni, P A

    2010-10-01

    Intense beams of heavy ions are capable of heating volumetric samples of matter to high energy density. Experiments are performed on the resulting warm dense matter (WDM) at the NDCX-I ion beam accelerator. The 0.3 MeV, 30 mA K(+) beam from NDCX-I heats foil targets by combined longitudinal and transverse neutralized drift compression of the ion beam. Both the compressed and uncompressed parts of the NDCX-I beam heat targets. The exotic state of matter (WDM) in these experiments requires specialized diagnostic techniques. We have developed a target chamber and fielded target diagnostics including a fast multichannel optical pyrometer, optical streak camera, laser Doppler-shift interferometer (Velocity Interferometer System for Any Reflector), beam transmission diagnostics, and high-speed gated cameras. We also present plans and opportunities for diagnostic development and a new target chamber for NDCX-II. PMID:21033977

  12. DIAGNOSTICS FOR ION BEAM DRIVEN HIGH ENERGY DENSITY PHYSICS EXPERIMENTS

    SciTech Connect

    Bieniosek, F.M.; Henestroza, E.; Lidia, S.; Ni, P.A.

    2010-01-04

    Intense beams of heavy ions are capable of heating volumetric samples of matter to high energy density. Experiments are performed on the resulting warm dense matter (WDM) at the NDCX-I ion beam accelerator. The 0.3 MeV, 30-mA K{sup +} beam from NDCX-I heats foil targets by combined longitudinal and transverse neutralized drift compression of the ion beam. Both the compressed and uncompressed parts of the NDCX-I beam heat targets. The exotic state of matter (WDM) in these experiments requires specialized diagnostic techniques. We have developed a target chamber and fielded target diagnostics including a fast multi-channel optical pyrometer, optical streak camera, laser Doppler-shift interferometer (VISAR), beam transmission diagnostics, and high-speed gated cameras. We also present plans and opportunities for diagnostic development and a new target chamber for NDCX-II.

  13. Use of the focused ion beam to locate failure sites within electrically erasable read only memory microcircuits

    NASA Astrophysics Data System (ADS)

    Haythornthwaite, Ray; Nxumalo, Jochonia; Phaneuf, Michael W.

    2004-05-01

    Occasional electronically erasable programmable read only memory retention failures occurred after thousands of read write cycles. The physical sites of the failed cells were known, but not their location within the individual memory bits. Memory storage transistors have normal gate oxides and thinner tunneling oxide regions for programming. Focused ion beam (FIB) images are brighter when samples are grounded due to a passive voltage contrast mechanism. Thus, using precision etching and polishing to expose memory cells, transistors with leaky (grounded) gate-to-channel characteristics stand out. FIB examination successfully identified the failed transistors and additionally highlighted previously undetected leaky but still functional cells. FIB etching was next used to physically isolate the normal gate and tunneling oxide regions of failed transistors. This proved that the leakage only occurred within the tunnel oxide regions. Further analysis using precision focused ion beam/transmission electron microscopy cross sectioning and atomic force microscopy, identified local thickness reductions in the tunnel oxide which occurred during manufacture. Gate dielectric breakdown failures increase very rapidly with reduced thickness. Calculations showed that unacceptable gate oxide leakage would develop in a time comparable with the observed memory loss failures. .

  14. Computational modelling and optimisation of the fabrication of nano-structures using focused ion beam and imprint forming technologies

    NASA Astrophysics Data System (ADS)

    Stoyanov, S.; Bailey, C.; Tang, Y. K.; Marson, S.; Dyer, A.; Allen, D.; Desmulliez, M.

    2010-11-01

    Focused Ion Beam (FIB) and Nano-Imprint Forming (NIF) have gained recently major interest because of their potential to enable the fabrication of precision engineering parts and to deliver high resolution, low-cost and high-throughput production of fine sub-micrometre structures respectively. Using computational modelling and simulation becomes increasingly important in assessing capabilities and risks of defects with respect to product manufacturability, quality, reliability and performance, as well as controlling and optimising the process parameters. A computational model that predicts the milling depth as function of the ion beam dwell times and a number of process parameters in the case of FIB milling is investigated and experimentally validated. The focus in the NIF study is on modelling the material deformation and the filling of the pattern grooves during the mould pressing using non-linear large deformation finite element analysis with hyperelastic non-compressive material behaviour. Simulation results are used to understand the risk of imperfections in the pattern replication and to identify the optimal process parameters and their interaction.

  15. Ion energy distributions in dual frequency RF plasmas

    NASA Astrophysics Data System (ADS)

    Hatton, Peter; Rees, John; Bort, Sam; Seymour, Dave

    2015-09-01

    For many surface-processing applications involving plasmas operated at RF frequencies it has been found helpful to combine two sources of power operating at different frequencies. By choosing suitable input powers at the two frequencies and varying the phase relationship set between the two inputs, the energy distributions (IEDs) for the ions arriving at the target surface can be optimised. There have been, however, only a limited number of published reports of measured or modelled distributions. In the present work IEDs for both positive and negative ions formed in plasmas in argon and nitrous oxide have been measured for mass-identified ions in two different reactors, one of which is a parallel-plate, capacitatively-coupled, system and the other is an inductively-coupled system. Typical data for 13.56 and 27.1 MHz inputs are presented for a range of phase relationships. The IEDs show clearly significant differences between the data for different species of ions which result in part from the ion-molecule collisions occurring, particularly in the plasma/surface sheath regions.

  16. Chemical modification of polypropylene induced by high energy carbon ions

    NASA Astrophysics Data System (ADS)

    Saha, A.; Chakraborty, V.; Chintalapudi, S. N.

    2000-06-01

    Polypropylene was irradiated with 12C + ions of 3.6 and 5.4 MeV energy using 3 MV Pelletron. The spectral changes owing to ion bombardment were investigated by UV-VIS and Fourier-transform infrared (FTIR) spectroscopy. A gradual increase in absorbance was observed around visible and near visible region with increase in fluence of bombarding ions. The difference absorption spectra show formation of chromophoric groups with wavelength maximum near 380 nm at lower fluence, but at high fluence a shift in peak is observed. The chromophoric groups are likely to be the extended conjugated polyene system and the red shift in peak postion at high fluence may be attributed to the greater degree of conjugation. The formation of unsaturated linkage is confirmed by the FTIR spectra with observed stretching band around 1650 cm -1 and its intensity was found to increase with increase in ion fluence studied. The gases (in the range 2-80 amu) which were evolved due to interaction of polypropylene with 12C + ions were measured with Residual Gas Analyzer (RGA). A large number of gaseous components were detected. This shows that polymer chains break into some smaller fragments which concomitantly leads to extended conjugation.

  17. Sharpening of field emitter tips using high-energy ions

    DOEpatents

    Musket, Ronald G.

    1999-11-30

    A process for sharpening arrays of field emitter tips of field emission cathodes, such as found in field-emission, flat-panel video displays. The process uses sputtering by high-energy (more than 30 keV) ions incident along or near the longitudinal axis of the field emitter to sharpen the emitter with a taper from the tip or top of the emitter down to the shank of the emitter. The process is particularly applicable to sharpening tips of emitters having cylindrical or similar (e.g., pyramidal) symmetry. The process will sharpen tips down to radii of less than 12 nm with an included angle of about 20 degrees. Because the ions are incident along or near the longitudinal axis of each emitter, the tips of gated arrays can be sharpened by high-energy ion beams rastered over the arrays using standard ion implantation equipment. While the process is particularly applicable for sharpening of arrays of field emitters in field-emission flat-panel displays, it can be effectively utilized in the fabrication of other vacuum microelectronic devices that rely on field emission of electrons.

  18. Low energy electrons and swift ion track structure in PADC

    DOE PAGES

    Fromm, Michel; Quinto, Michele A.; Weck, Philippe F.; Champion, Christophe

    2015-05-27

    The current work aims at providing an accurate description of the ion track-structure in poly-allyl dyglycol carbonate (PADC) by using an up-to-date Monte-Carlo code-called TILDA-V (a French acronym for Transport d’Ions Lourds Dans l’Aqua & Vivo). In this simulation the ion track-structure in PADC is mainly described in terms of ejected electrons with a particular attention done to the Low Energy Electrons (LEEs). After a brief reminder of the most important channels through which LEEs are prone to break a chemical bond, we will report on the simulated energetic distributions of LEEs along an ion track in PADC for particularmore » incident energies located on both sides of the Bragg-peak position. Lastly, based on the rare data dealing with LEEs interaction with polymers or organic molecules, we will emphasise the role played by the LEEs in the formation of a latent track in PADC, and more particularly the one played by the sub-ionization electrons.« less

  19. Low energy electrons and swift ion track structure in PADC

    SciTech Connect

    Fromm, Michel; Quinto, Michele A.; Weck, Philippe F.; Champion, Christophe

    2015-05-27

    The current work aims at providing an accurate description of the ion track-structure in poly-allyl dyglycol carbonate (PADC) by using an up-to-date Monte-Carlo code-called TILDA-V (a French acronym for Transport d’Ions Lourds Dans l’Aqua & Vivo). In this simulation the ion track-structure in PADC is mainly described in terms of ejected electrons with a particular attention done to the Low Energy Electrons (LEEs). After a brief reminder of the most important channels through which LEEs are prone to break a chemical bond, we will report on the simulated energetic distributions of LEEs along an ion track in PADC for particular incident energies located on both sides of the Bragg-peak position. Lastly, based on the rare data dealing with LEEs interaction with polymers or organic molecules, we will emphasise the role played by the LEEs in the formation of a latent track in PADC, and more particularly the one played by the sub-ionization electrons.

  20. Energy straggling of low-energy ion beam in a charge exchange cell for negative ion production

    SciTech Connect

    Takeuchi, S.; Sasao, M.; Sugawara, H.; Tanaka, N.; Kisaki, M.; Okamoto, A.; Shinto, K.; Kitajima, S.; Nishiura, M.; Wada, M.

    2008-02-15

    Energy straggling in a charge exchange cell, which is frequently used for negative ion production, was studied experimentally and compared with the results of theoretical evaluation. The change of the energy spectrum of a He{sup +} beam due to charge exchange processes in argon gas was measured in the energy range of 2-6 keV. Energy straggling by multiple collisions is expressed by the energy loss formula due to inelastic and elastic processes. The impact parameter is related to the elastic scattering angle, and the geometry of the charge exchange cell and other components of the beam transportation system determines the maximum acceptable scattering angle. The energy spread was evaluated taking the integral limit over the impact parameter into consideration. The theoretical results showed good agreement with those of actual measurement.

  1. Low-energy-spread laser wakefield acceleration using ionization injection with a tightly focused laser in a mismatched plasma channel

    NASA Astrophysics Data System (ADS)

    Li, F.; Zhang, C. J.; Wan, Y.; Wu, Y. P.; Xu, X. L.; Hua, J. F.; Pai, C. H.; Lu, W.; Gu, Y. Q.; Mori, W. B.; Joshi, C.

    2016-03-01

    An improved ionization injection scheme for laser wakefield acceleration using a tightly focused laser pulse, with intensity near the ionization threshold to trigger the injection in a mismatched plasma channel, has been proposed and examined via 3D particle-in-cell (PIC) simulations. In this scheme, the key to achieving a very low energy spread is shortening the injection distance through the fast diffraction of the tightly focused laser. Furthermore, the oscillation of the laser envelope in the mismatched plasma channel can induce multiple low-energy-spread injections with an even distribution in both space and energy. The envelope oscillation can also significantly enhance the energy gain of the injected beams compared to the standard non-evolving wake scenario due to the rephasing between the electron beam and the laser wake. A theoretical model has been derived to precisely predict the injection distance, the ionization degree of injection atoms/ions, the electron yield as well as the ionized charge for given laser-plasma parameters, and such expressions can be directly utilized for optimizing the quality of the injected beam. Through 3D PIC simulations, we show that an injection distance as short as tens of microns can be achieved, which leads to ultrashort fs, few pC electron bunches with a narrow absolute energy spread around 2 MeV (rms). Simulations also show that the initial absolute energy spread remains nearly constant during the subsequent acceleration due to the very short bunch length, and this indicates that further acceleration of the electron bunches up to the GeV level may lead to an electron beam with an energy spread well below 0.5%. Such low-energy-spread electron beams may have potential applications for future coherent light sources driven by laser-plasma accelerators.

  2. Theoretical aspects of high-energy heavy-ion reactions

    SciTech Connect

    Wong, Cheuk-Yin

    1987-01-01

    An elementary introduction is given to the subject of nucleus-nucleus collisions at high energies. It begins with a discussion on the relevant kinematic variables to establish the language for these collisions. It examines the question of particle production and the characteristics of the loss of baryon energy in an inelastic nucleon-nucleon collision. The geometrical aspect of a nucleus-nucleus collision is then described in terms of the Glauber multiple-collision model. As the theory of relativistic heavy-ion collision has not yet reached a stage whereby the dynamics can be examined from a fundamental theory, various phenomenological models have been proposed. The assumptions used in various models are described. Future use of relativistic heavy-ion collisions to study the quark-gluon plasma is briefly discussed.

  3. Performance Characterization of High Energy Commercial Lithium-ion Cells

    NASA Technical Reports Server (NTRS)

    Schneidegger, Brianne T.

    2010-01-01

    The NASA Glenn Research Center Electrochemistry Branch performed characterization of commercial lithium-ion cells to determine the cells' performance against Exploration Technology Development Program (ETDP) Key Performance Parameters (KPP). The goals of the ETDP Energy Storage Project require significant improvements in the specific energy of lithium-ion technology over the state-of-the-art. This work supports the high energy cell development for the Constellation customer Lunar Surface Systems (LSS). In support of these goals, testing was initiated in September 2009 with high energy cylindrical cells obtained from Panasonic and E-One Moli. Both manufacturers indicated the capability of their cells to deliver specific energy of at least 180 Wh/kg or higher. Testing is being performed at the NASA Glenn Research Center to evaluate the performance of these cells under temperature, rate, and cycling conditions relevant to the ETDP goals for high energy cells. The cell-level specific energy goal for high energy technology is 180 Wh/kg at a C/10 rate and 0 C. The threshold value is 165 Wh/kg. The goal is to operate for at least 2000 cycles at 100 percent DOD with greater than 80 percent capacity retention. The Panasonic NCR18650 cells were able to deliver nearly 200 Wh/kg at the aforementioned conditions. The E-One Moli ICR18650J cells also met the specific energy goal by delivering 183 Wh/kg. Though both cells met the goal for specific energy, this testing was only one portion of the testing required to determine the suitability of commercial cells for the ETDP. The cells must also meet goals for cycle life and safety. The results of this characterization are summarized in this report.

  4. Feasibility of a 90° electric sector energy analyzer for low energy ion beam characterization

    SciTech Connect

    Mahinay, C. L. S. Ramos, H. J.; Wada, M.

    2015-02-15

    A simple formula to calculate refocusing by locating the output slit at a specific distance away from the exit of 90° ion deflecting electric sector is given. Numerical analysis is also performed to calculate the ion beam trajectories for different values of the initial angular deviation of the beam. To validate the theory, a compact (90 mm × 5.5 mm × 32 mm) 90° sector ESA is fabricated which can fit through the inner diameter of a conflat 70 vacuum flange. Experimental results show that the dependence of resolution upon the distance between the sector exit and the Faraday cup agrees with the theory. The fabricated 90° sector electrostatic energy analyzer was then used to measure the space resolved ion energy distribution functions of an ion beam with the energy as low as 600 eV.

  5. Damage growth in Si during self-ion irradiation: A study of ion effects over an extended energy range

    SciTech Connect

    Holland, O.W.; El-Ghor, M.K.; White, C.W.

    1989-01-01

    Damage nucleation/growth in single-crystal Si during ion irradiation is discussed. For MeV ions, the rate of growth as well as the damage morphology are shown to vary widely along the track of the ion. This is attributed to a change in the dominant, defect-related reactions as the ion penetrates the crystal. The nature of these reactions were elucidated by studying the interaction of MeV ions with different types of defects. The defects were introduced into the Si crystal prior to high-energy irradiation by self-ion implantation at a medium energy (100 keV). Varied damage morphologies were produced by implanting different ion fluences. Electron microscopy and ion-channeling measurements, in conjunction with annealing studies, were used to characterize the damage. Subtle changes in the predamage morphology are shown to result in markedly different responses to the high-energy irradiation, ranging from complete annealing of the damage to rapid growth. These divergent responses occur over a narrow range of dose (2--3 /times/ 10/sup 14/ cm/sup /minus/2/) of the medium-energy ions; this range also marks a transition in the growth behavior of the damage during the predamage implantation. A model is proposed which accounts for these observations and provides insight into ion-induced growth of amorphous layers in Si and the role of the amorphous/crystalline interface in this process. 15 refs, 9 figs.

  6. Effect of Low-Energy Ions on Plasma-Enhanced Deposition of Cubic Boron Nitride

    NASA Astrophysics Data System (ADS)

    Torigoe, M.; Fukui, S.; Teii, K.; Matsumoto, S.

    2015-09-01

    The effect of low-energy ions on deposition of cubic boron nitride (cBN) films in an inductively coupled plasma with the chemistry of fluorine is studied in terms of ion energy, ion flux, and ion to boron flux ratio onto the substrate. The ion energy and the ion to boron flux ratio are determined from the sheath potential and the ratio of incident ion flux to net deposited boron flux, respectively. For negative substrate biases where sp2-bonded BN phase only or no deposit is formed, both the ion energy and the ion to boron flux ratio are high. For positive substrate biases where cBN phase is formed, the ion energy and the ion to boron flux ratio are estimated in the range of a few eV to 35 eV and 100 to 130, respectively. The impact of negative ions is presumed to be negligible due to their low kinetic energy relative to the sheath potential over the substrate surface. The impact of positive ions with high ion to boron flux ratios is primarily responsible for reduction of the ion energy for cBN film deposition. Work supported in part by a Grant-in-Aid for Scientific Research (B), a Funding Program for Next Generation World-Leading Researchers, and an Industrial Technology Research Grant Program 2008.

  7. Laser acceleration of low emittance, high energy ions and applications

    NASA Astrophysics Data System (ADS)

    Fuchs, Julien; Audebert, Patrick; Borghesi, Marco; Pépin, Henri; Willi, Oswald

    2009-03-01

    Laser-accelerated ion sources have exceptional properties, i.e. high brightness and high spectral cut-off (56 MeV at present), high directionality and laminarity (at least 100-fold better than conventional accelerators beams), short burst duration (ps). Thanks to these properties, these sources open new opportunities for applications. Among these, we have already explored their use for proton radiography of fields in plasmas and for warm dense matter generation. These sources could also stimulate development of compact ion accelerators or be used for medical applications. To extend the range of applications, ion energy and conversion efficiency must however be increased. Two strategies for doing so using present-day lasers have been successfully explored in LULI experiments. In view of applications, it is also essential to control (i.e. collimate and energy select) these beams. For this purpose, we have developed an ultra-fast laser-triggered micro-lens providing tuneable control of the beam divergence as well as energy selection. To cite this article: J. Fuchs et al., C. R. Physique 10 (2009).

  8. Low energy ions in the heavy ions in space (HIIS) experiment on LDEF.

    PubMed

    Kleis, T; Tylka, A J; Boberg, P R; Adams, J H; Beahm, L P

    1996-01-01

    We present data from the Lexan top stacks in the Heavy Ions In Space (HIIS) experiment which was flown for six years (April 1984-Jan 1990) onboard the LDEF spacecraft in 28.5 degrees orbit at about 476 km altitude. HIIS was built of passive (i.e. no timing resolution) plastic track detectors which collected particles continuously over the entire mission. In this paper we present data on low energy heavy ions (10 < or = Z, 20MeV/nuc < E < 200 MeV/nuc). These ions are far below the geomagnetic cutoff for fully ionized ions in the LDEF orbit even after taking into account the severe cutoff suppression caused by occasional large geomagnetic storms during the LDEF mission. Our preliminary results indicate an unusual elemental composition of trapped particles in the inner magnetosphere during the LDEF mission, including both trapped anomalous cosmic ray species (Ne, Ar) and other elements (such as Mg and Fe) which are not found in the anomalous component of cosmic rays. The origin of the non-anomalous species is not understood, but they may be associated with the solar energetic particle events and geomagnetic disturbances of 1989.

  9. HIGH ENERGY DENSITY PHYSICS EXPERIMENTS WITH INTENSE HEAVY ION BEAMS

    SciTech Connect

    Bieniosek, F.M.; Henestroza, E.; Leitner, M.; Logan, B.G.; More, R.M.; Roy, P.K.; Ni, P.; Seidl, P.A.; Waldron, W.L.; Barnard, J.J.

    2008-08-01

    The US heavy ion fusion science program has developed techniques for heating ion-beam-driven warm dense matter (WDM) targets. The WDM conditions are to be achieved by combined longitudinal and transverse space-charge neutralized drift compression of the ion beam to provide a hot spot on the target with a beam spot size of about 1 mm, and pulse length about 1-2 ns. As a technique for heating volumetric samples of matter to high energy density, intense beams of heavy ions are capable of delivering precise and uniform beam energy deposition dE/dx, in a relatively large sample size, and the ability to heat any solid-phase target material. Initial experiments use a 0.3 MeV K+ beam (below the Bragg peak) from the NDCX-I accelerator. Future plans include target experiments using the NDCX-II accelerator, which is designed to heat targets at the Bragg peak using a 3-6 MeV lithium ion beam. The range of the beams in solid matter targets is about 1 micron, which can be lengthened by using porous targets at reduced density. We have completed the fabrication of a new experimental target chamber facility for WDM experiments, and implemented initial target diagnostics to be used for the first target experiments in NDCX-1. The target chamber has been installed on the NDCX-I beamline. The target diagnostics include a fast multi-channel optical pyrometer, optical streak camera, VISAR, and high-speed gated cameras. Initial WDM experiments will heat targets by compressed NDCX-I beams and will explore measurement of temperature and other target parameters. Experiments are planned in areas such as dense electronegative targets, porous target homogenization and two-phase equation of state.

  10. HIGH ENERGY DENSITY PHYSICS EXPERIMENTS WITH INTENSE HEAVY ION BEAMS

    SciTech Connect

    Henestroza, E.; Leitner, M.; Logan, B.G.; More, R.M.; Roy, P.K.; Ni, P.; Seidl, P.A.; Waldron, W.L.; Barnard, J.J.

    2010-03-16

    The US heavy ion fusion science program has developed techniques for heating ion-beam-driven warm dense matter (WDM) targets. The WDM conditions are to be achieved by combined longitudinal and transverse space-charge neutralized drift compression of the ion beam to provide a hot spot on the target with a beam spot size of about 1 mm, and pulse length about 1-2 ns. As a technique for heating volumetric samples of matter to high energy density, intense beams of heavy ions are capable of delivering precise and uniform beam energy deposition dE/dx, in a relatively large sample size, and the ability to heat any solid-phase target material. Initial experiments use a 0.3 MeV K+ beam (below the Bragg peak) from the NDCX-I accelerator. Future plans include target experiments using the NDCX-II accelerator, which is designed to heat targets at the Bragg peak using a 3-6 MeV lithium ion beam. The range of the beams in solid matter targets is about 1 micron, which can be lengthened by using porous targets at reduced density. We have completed the fabrication of a new experimental target chamber facility for WDM experiments, and implemented initial target diagnostics to be used for the first target experiments in NDCX-1. The target chamber has been installed on the NDCX-I beamline. The target diagnostics include a fast multi-channel optical pyrometer, optical streak camera, VISAR, and high-speed gated cameras. Initial WDM experiments will heat targets by compressed NDCX-I beams and will explore measurement of temperature and other target parameters. Experiments are planned in areas such as dense electronegative targets, porous target homogenization and two-phase equation of state.

  11. Generation and focusing of pulsed intense ion beams: Final report, 1 July 1987--30 September 1988

    SciTech Connect

    Hammer, D.A.; Kusse, B.R.; Sudan, R.N.

    1989-08-03

    This paper discusses the following experiments: ion diode experiments at 0.5 /times/ 10/sup 12/ W on the LION accelerator; spectroscopic studies of ion diodes; ion beam-plasma channel transport research; and plasma opening switch experiments.

  12. Experimental validation of a novel compact focusing scheme for future energy-frontier linear lepton colliders.

    PubMed

    White, G R; Ainsworth, R; Akagi, T; Alabau-Gonzalvo, J; Angal-Kalinin, D; Araki, S; Aryshev, A; Bai, S; Bambade, P; Bett, D R; Blair, G; Blanch, C; Blanco, O; Blaskovic-Kraljevic, N; Bolzon, B; Boogert, S; Burrows, P N; Christian, G; Corner, L; Davis, M R; Faus-Golfe, A; Fukuda, M; Gao, J; García-Morales, H; Geffroy, N; Hayano, H; Heo, A Y; Hildreth, M; Honda, Y; Huang, J Y; Hwang, W H; Iwashita, Y; Jang, S; Jeremie, A; Kamiya, Y; Karataev, P; Kim, E S; Kim, H S; Kim, S H; Kim, Y I; Komamiya, S; Kubo, K; Kume, T; Kuroda, S; Lam, B; Lekomtsev, K; Liu, S; Lyapin, A; Marin, E; Masuzawa, M; McCormick, D; Naito, T; Nelson, J; Nevay, L J; Okugi, T; Omori, T; Oroku, M; Park, H; Park, Y J; Perry, C; Pfingstner, J; Phinney, N; Rawankar, A; Renier, Y; Resta-López, J; Ross, M; Sanuki, T; Schulte, D; Seryi, A; Shevelev, M; Shimizu, H; Snuverink, J; Spencer, C; Suehara, T; Sugahara, R; Takahashi, T; Tanaka, R; Tauchi, T; Terunuma, N; Tomás, R; Urakawa, J; Wang, D; Warden, M; Wendt, M; Wolski, A; Woodley, M; Yamaguchi, Y; Yamanaka, T; Yan, J; Yokoya, K; Zimmermann, F

    2014-01-24

    A novel scheme for the focusing of high-energy leptons in future linear colliders was proposed in 2001 [P. Raimondi and A. Seryi, Phys. Rev. Lett. 86, 3779 (2001)]. This scheme has many advantageous properties over previously studied focusing schemes, including being significantly shorter for a given energy and having a significantly better energy bandwidth. Experimental results from the ATF2 accelerator at KEK are presented that validate the operating principle of such a scheme by demonstrating the demagnification of a 1.3 GeV electron beam down to below 65 nm in height using an energy-scaled version of the compact focusing optics designed for the ILC collider.

  13. Evaluating focused ion beam and ultramicrotome sample preparation for analytical microscopies of the cathode layer of a polymer electrolyte membrane fuel cell

    NASA Astrophysics Data System (ADS)

    de A. Melo, Lis G.; Hitchcock, Adam P.; Berejnov, Viatcheslav; Susac, Darija; Stumper, Juergen; Botton, Gianluigi A.

    2016-04-01

    Optimizing the structure of the porous electrodes of polymer electrolyte membrane fuel cells (PEM-FC) can improve device power and durability. Analytical microscopy techniques are important tools for measuring the electrode structure, thereby providing guidance for structural optimization. Transmission Electron Microscopy (TEM), with either Energy Dispersive X-Ray (EDX) or Electron Energy Loss Spectroscopy (EELS) analysis, and Scanning Transmission X-Ray Microscopy (STXM) are complementary methods which, together, provide a powerful approach for PEM-FC electrode analysis. Both TEM and STXM require thin (50-200 nm) samples, which can be prepared either by Focused Ion Beam (FIB) milling or by embedding and ultramicrotomy. Here we compare TEM and STXM spectromicroscopy analysis of FIB and ultramicrotomy sample preparations of the same PEM-FC sample, with focus on how sample preparation affects the derived chemical composition and spatial distributions of carbon support and ionomer. The FIB lamella method, while avoiding pore-filling by embedding media, had significant problems. In particular, in the FIB sample the carbon support was extensively amorphized and the ionomer component suffered mass loss and structural damage. Although each sample preparation technique has a role to play in PEM-FC optimization studies, it is important to be aware of the limitations of each method.

  14. Ion Temperature and Hydrodynamic-Energy Measurements in a Z-Pinch Plasma at Stagnation

    SciTech Connect

    Kroupp, E.; Osin, D.; Starobinets, A.; Fisher, V.; Bernshtam, V.; Weingarten, L.; Maron, Y.; Uschmann, I.; Foerster, E.; Fisher, A.; Cuneo, M. E.; Deeney, C.; Giuliani, J. L.

    2011-09-02

    The time history of the local ion kinetic energy in a stagnating plasma was determined from Doppler-dominated line shapes. Using independent determination of the plasma properties for the same plasma region, the data allowed for inferring the time-dependent ion temperature, and for discriminating the temperature from the total ion kinetic energy. It is found that throughout most of the stagnation period the ion thermal energy constitutes a small fraction of the total ion kinetic energy; the latter is dominated by hydrodynamic motion. Both the ion hydrodynamic and thermal energies are observed to decrease to the electron thermal energy by the end of the stagnation period. It is confirmed that the total ion kinetic energy available at the stagnating plasma and the total radiation emitted are in balance, as obtained in our previous experiment. The dissipation time of the hydrodynamic energy thus appears to determine the duration (and power) of the K emission.

  15. Comprehensive RNA-Seq Expression Analysis of Sensory Ganglia with a Focus on Ion Channels and GPCRs in Trigeminal Ganglia

    PubMed Central

    Manteniotis, Stavros; Lehmann, Ramona; Flegel, Caroline; Vogel, Felix; Hofreuter, Adrian; Schreiner, Benjamin S. P.; Altmüller, Janine; Becker, Christian; Schöbel, Nicole; Hatt, Hanns; Gisselmann, Günter

    2013-01-01

    The specific functions of sensory systems depend on the tissue-specific expression of genes that code for molecular sensor proteins that are necessary for stimulus detection and membrane signaling. Using the Next Generation Sequencing technique (RNA-Seq), we analyzed the complete transcriptome of the trigeminal ganglia (TG) and dorsal root ganglia (DRG) of adult mice. Focusing on genes with an expression level higher than 1 FPKM (fragments per kilobase of transcript per million mapped reads), we detected the expression of 12984 genes in the TG and 13195 in the DRG. To analyze the specific gene expression patterns of the peripheral neuronal tissues, we compared their gene expression profiles with that of the liver, brain, olfactory epithelium, and skeletal muscle. The transcriptome data of the TG and DRG were scanned for virtually all known G-protein-coupled receptors (GPCRs) as well as for ion channels. The expression profile was ranked with regard to the level and specificity for the TG. In total, we detected 106 non-olfactory GPCRs and 33 ion channels that had not been previously described as expressed in the TG. To validate the RNA-Seq data, in situ hybridization experiments were performed for several of the newly detected transcripts. To identify differences in expression profiles between the sensory ganglia, the RNA-Seq data of the TG and DRG were compared. Among the differentially expressed genes (> 1 FPKM), 65 and 117 were expressed at least 10-fold higher in the TG and DRG, respectively. Our transcriptome analysis allows a comprehensive overview of all ion channels and G protein-coupled receptors that are expressed in trigeminal ganglia and provides additional approaches for the investigation of trigeminal sensing as well as for the physiological and pathophysiological mechanisms of pain. PMID:24260241

  16. Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia.

    PubMed

    Saowadee, N; Agersted, K; Bowen, J R

    2012-06-01

    This study investigates the effect of focused ion beam (FIB) current and accelerating voltage on electron backscatter diffraction pattern quality of yttria-stabilized zirconia (YSZ) and Nb-doped strontium titanate (STN) to optimize data quality and acquisition time for 3D-EBSD experiments by FIB serial sectioning. Band contrast and band slope were used to describe the pattern quality. The FIB probe currents investigated ranged from 100 to 5000 pA and the accelerating voltage was either 30 or 5 kV. The results show that 30 kV FIB milling induced a significant reduction of the pattern quality of STN samples compared to a mechanically polished surface but yielded a high pattern quality on YSZ. The difference between STN and YSZ pattern quality is thought to be caused by difference in the degree of ion damage as their backscatter coefficients and ion penetration depths are virtually identical. Reducing the FIB probe current from 5000 to 100 pA improved the pattern quality by 20% for STN but only showed a marginal improvement for YSZ. On STN, a conductive coating can help to improve the pattern quality and 5 kV polishing can lead to a 100% improvement of the pattern quality relatively to 30 kV FIB milling. For 3D-EBSD experiments of a material such as STN, it is recommended to combine a high kV FIB milling and low kV polishing for each slice in order to optimize the data quality and acquisition time. PMID:22582798

  17. Microstructural characterization of Ti-6Al-4V metal chips by focused ion beam (FIB) and transmission electron microscopy (TEM)

    SciTech Connect

    Schneider, Judy; Dong, Lei; Howe, Jane Y; Meyer III, Harry M

    2011-01-01

    The microstructure of the secondary deformation zone (SDZ) near the cutting surface in metal chips of Ti-6Al-4V formed during machining was investigated using focused ion beam (FIB) specimen preparation and transmission electron microscopy (TEM) imaging. Use of the FIB allowed precise extraction of the specimen across this region to reveal its inhomogeneous microstructure resulting from the non-uniform distribution of strain, strain rate, and temperature generated during the cutting process. Initial imaging from conventional TEM foil preparation revealed microstructures ranging from heavily textured to regions of fine grains. Using FIB preparation, the transverse microstructure could be interpreted as fine grains near the cutting surface which transitioned to coarse grains toward the free surface. At the cutting surface a 10 nm thick recrystallized layer was observed capping a 20 nm thick amorphous layer.

  18. Characterization of nanometer-scale porosity in reservoir carbonate rock by focused ion beam-scanning electron microscopy.

    PubMed

    Bera, Bijoyendra; Gunda, Naga Siva Kumar; Mitra, Sushanta K; Vick, Douglas

    2012-02-01

    Sedimentary carbonate rocks are one of the principal porous structures in natural reservoirs of hydrocarbons such as crude oil and natural gas. Efficient hydrocarbon recovery requires an understanding of the carbonate pore structure, but the nature of sedimentary carbonate rock formation and the toughness of the material make proper analysis difficult. In this study, a novel preparation method was used on a dolomitic carbonate sample, and selected regions were then serially sectioned and imaged by focused ion beam-scanning electron microscopy. The resulting series of images were used to construct detailed three-dimensional representations of the microscopic pore spaces and analyze them quantitatively. We show for the first time the presence of nanometer-scale pores (50-300 nm) inside the solid dolomite matrix. We also show the degree of connectivity of these pores with micron-scale pores (2-5 μm) that were observed to further link with bulk pores outside the matrix.

  19. Cross-sectional analysis of W-cored Ni nanoparticle via focused ion beam milling with impregnation.

    PubMed

    Jeong, Saeeun; Na, Hyunwoong; Lee, Gwangyeob; Son, Seong Ho; Choi, Hanshin

    2014-01-01

    Tungsten and nickel bimetallic nanoparticle is synthesized by radio frequency thermal plasma process which belongs to the vapor phase condensation technology. The morphology and chemical composition of the synthesized particle were investigated using the conventional nanoparticle transmission electron microscopy (TEM) sample. A few part of them looked like core/shell structured particle, but ambiguities were caused by either TEM sample preparation or TEM analysis. In order to clarify whether a core/shell structure is developed for the particle, various methodologies were tried to prepare a cross-sectional TEM sample. Focused ion beam (FIB) milling was conducted for cold-compacted particles, dispersed particles on silicon wafer, and impregnated particles with epoxy which is compatible with electron beam. A sound cross-sectional sample was just obtained from cyanoacrylate impregnation and FIB milling procedure. A tungsten-cored nickel shell structure was precisely confirmed with aid of cross-sectional sample preparation method.

  20. Fabrication of high sensitivity 3D nanoSQUIDs based on a focused ion beam sculpting technique

    NASA Astrophysics Data System (ADS)

    De Leo, Natascia; Fretto, Matteo; Lacquaniti, Vincenzo; Granata, Carmine; Vettoliere, Antonio

    2016-09-01

    In this paper a nanofabrication process, based on a focused ion beam (FIB) nanosculpting technique, for high sensitivity three-dimensional nanoscale superconducting quantum interference devices (nanoSQUIDs) is reported. The crucial steps of the fabrication process are described, as are some peculiar features of the superconductor-normal metal-insulator-superconductor (SNIS) Josephson junctions, which may useful for applications in cryocooler systems. This fabrication procedure is employed to fabricate sandwich nanojunctions and high sensitivity nanoSQUIDs. Specifically, the superconductive nanosensors have a rectangular loop of 1 × 0.2-0.4 μm2 interrupted by two square Nb/Al-AlO x /Nb SNIS Josephson junctions with side lengths of 0.3 μm. The characterization of a typical nanoSQUID has been carried out and a spectral density of magnetic flux noise as low as 0.8 μΦ0 Hz-1/2 has been measured.