Sample records for esd protection circuit

  1. ESD protection design for advanced CMOS

    NASA Astrophysics Data System (ADS)

    Huang, Jin B.; Wang, Gewen

    2001-10-01

    ESD effects in integrated circuits have become a major concern as today's technologies shrink to sub-micron/deep- sub-micron dimensions. The thinner gate oxide and shallower junction depth used in the advanced technologies make them very vulnerable to ESD damages. The advanced techniques like silicidation and STI (shallow trench insulation) used for improving other device performances make ESD design even more challenging. For non-silicided technologies, a certain DCGS (drain contact to gate edge spacing) is needed to achieve ESD hardness for nMOS output drivers and nMOS protection transistors. The typical DCGS values are 4-5um and 2-3um for 0.5um and 0.25um CMOS, respectively. The silicidation reduces the ballast resistance provided by DCGS with at least a factor of 10. As a result, scaling of the ESD performance with device width is lost and even zero ESD performance is reported for standard silicided devices. The device level ESD design is focused in this paper, which includes GGNMOS (gate grounded NMOS) and GCNMOS (gate coupled NMOS). The device level ESD testing including TLP (transmission line pulse) is given. Several ESD issues caused by advanced technologies have been pointed out. The possible solutions have been developed and summarized including silicide blocking, process optimization, back-end ballasting, and new protection scheme, dummy gate/n-well resistor ballsting, etc. Some of them require process cost increase, and others provide novel, compact, and simple design but involving royalty/IP (intellectual property) issue. Circuit level ESD design and layout design considerations are covered. The top-level ESD protection strategies are also given.

  2. A novel high performance ESD power clamp circuit with a small area

    NASA Astrophysics Data System (ADS)

    Zhaonian, Yang; Hongxia, Liu; Li, Li; Qingqing, Zhuo

    2012-09-01

    A MOSFET-based electrostatic discharge (ESD) power clamp circuit with only a 10 ns RC time constant for a 0.18-μm process is proposed. A diode-connected NMOSFET is used to maintain a long delay time and save area. The special structure overcomes other shortcomings in this clamp circuit. Under fast power-up events, the gate voltage of the clamp MOSFET does not rise as quickly as under ESD events, the special structure can keep the clamp MOSFET thoroughly off. Under a falsely triggered event, the special structure can turn off the clamp MOSFET in a short time. The clamp circuit can also reject the power supply noise effectively. Simulation results show that the clamp circuit avoids fast false triggering events such as a 30 ns/1.8 V power-up, maintains a 1.2 μs delay time and a 2.14 μs turn-off time, and reduces to about 70% of the RC time constant. It is believed that the proposed clamp circuit can be widely used in high-speed integrated circuits.

  3. Grounding Headphones for Protection Against ESD

    NASA Technical Reports Server (NTRS)

    Peters, John; Youngquist, Robert C.

    2004-01-01

    A simple alternative technique has been devised protecting delicate equipment against electrostatic discharge (ESD) in settings in which workers wear communication headsets. In the original setting in which the technique was devised, the workers who wear the headsets also wear anti-ESD grounding straps on their wrists. The alternative technique eliminates the need for the wrist grounding straps by providing for grounding through the headsets. In place of the electrically insulating foam pads on the headsets, one installs pads made of electrically conductive foam like that commonly used to protect electronic components. Grounding wires are attached to the conductive foam pads, then possibly to the shielding cable which may be grounded to the backshell on the connector. The efficacy of this technique in protecting against ESD has been verified in experiments. The electrical resistance of the pads is a few megohms - about the same as that of a human body between the fingers of opposite hands and, hence, low enough for grounding. The only drawback of the technique is that care must be taken to place the foam pads in contact with the user s skin: any hair that comes between the foam pads and the skin must be pushed aside because hair is electrically insulating and thus prevents adequate grounding.

  4. High ESD Breakdown-Voltage InP HBT Transimpedance Amplifier IC for Optical Video Distribution Systems

    NASA Astrophysics Data System (ADS)

    Sano, Kimikazu; Nagatani, Munehiko; Mutoh, Miwa; Murata, Koichi

    This paper is a report on a high ESD breakdown-voltage InP HBT transimpedance amplifier IC for optical video distribution systems. To make ESD breakdown-voltage higher, we designed ESD protection circuits integrated in the TIA IC using base-collector/base-emitter diodes of InP HBTs and resistors. These components for ESD protection circuits have already existed in the employed InP HBT IC process, so no process modifications were needed. Furthermore, to meet requirements for use in optical video distribution systems, we studied circuit design techniques to obtain a good input-output linearity and a low-noise characteristic. Fabricated InP HBT TIA IC exhibited high human-body-model ESD breakdown voltages (±1000V for power supply terminals, ±200V for high-speed input/output terminals), good input-output linearity (less than 2.9-% duty-cycle-distortion), and low noise characteristic (10.7pA/√Hz averaged input-referred noise current density) with a -3-dB-down higher frequency of 6.9GHz. To the best of our knowledge, this paper is the first literature describing InP ICs with high ESD-breakdown voltages.

  5. Safety and performance enhancement circuit for primary explosive detonators

    DOEpatents

    Davis, Ronald W [Tracy, CA

    2006-04-04

    A safety and performance enhancement arrangement for primary explosive detonators. This arrangement involves a circuit containing an energy storage capacitor and preset self-trigger to protect the primary explosive detonator from electrostatic discharge (ESD). The circuit does not discharge into the detonator until a sufficient level of charge is acquired on the capacitor. The circuit parameters are designed so that normal ESD environments cannot charge the protection circuit to a level to achieve discharge. When functioned, the performance of the detonator is also improved because of the close coupling of the stored energy.

  6. BIMOS transistor solutions for ESD protection in FD-SOI UTBB CMOS technology

    NASA Astrophysics Data System (ADS)

    Galy, Philippe; Athanasiou, S.; Cristoloveanu, S.

    2016-01-01

    We evaluate the Electro-Static Discharge (ESD) protection capability of BIpolar MOS (BIMOS) transistors integrated in ultrathin silicon film for 28 nm Fully Depleted SOI (FD-SOI) Ultra Thin Body and BOX (UTBB) high-k metal gate technology. Using as a reference our measurements in hybrid bulk-SOI structures, we extend the BIMOS design towards the ultrathin silicon film. Detailed study and pragmatic evaluations are done based on 3D TCAD simulation with standard physical models using Average Current Slope (ACS) method and quasi-static DC stress (Average Voltage Slope AVS method). These preliminary 3D TACD results are very encouraging in terms of ESD protection efficiency in advanced FD-SOI CMOS.

  7. Applying analog integrated circuits for HERO protection

    NASA Technical Reports Server (NTRS)

    Willis, Kenneth E.; Blachowski, Thomas J.

    1994-01-01

    One of the most efficient methods for protecting electro-explosive devices (EED's) from HERO and ESD is to shield the EED in a conducting shell (Faraday cage). Electrical energy is transferred to the bridge by means of a magnetic coupling which passes through a portion of the conducting shell that is made from a magnetically permeable but electrically conducting material. This technique was perfected by ML Aviation, a U.K. company, in the early 80's, and was called a Radio Frequency Attenuation Connector (RFAC). It is now in wide use in the U.K. Previously, the disadvantage of RFAC over more conventional methods was its relatively high cost, largely driven by a thick film hybrid circuit used to switch the primary of the transformer. Recently, through a licensing agreement, this technology has been transferred to the U.S. and significant cost reductions and performance improvements have been achieved by the introduction of analog integrated circuits. An integrated circuit performs the following functions: (1) Chops the DC input to a signal suitable for driving the primary of the transformer; (2) Verifies the input voltage is above a threshold; (3) Verifies the input voltage is valid for a pre set time before enabling the device; (4) Provides thermal protection of the circuit; and (5) Provides an external input for independent logic level enabling of the power transfer mechanism. This paper describes the new RFAC product and its applications.

  8. Modeling of ESD events from polymeric surfaces

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Pfeifer, Kent Bryant

    2014-03-01

    Transient electrostatic discharge (ESD) events are studied to assemble a predictive model of discharge from polymer surfaces. An analog circuit simulation is produced and its response is compared to various literature sources to explore its capabilities and limitations. Results suggest that polymer ESD events can be predicted to within an order of magnitude. These results compare well to empirical findings from other sources having similar reproducibility.

  9. Insight into multiple-triggering effect in DTSCRs for ESD protection

    NASA Astrophysics Data System (ADS)

    Zhang, Lizhong; Wang, Yuan; Wang, Yize; He, Yandong

    2017-07-01

    The diode-triggered silicon-controlled rectifier (DTSCR) is widely used for electrostatic discharge (ESD) protection in advanced CMOS process owing to its advantages, such as design simplification, adjustable trigger/holding voltage, low parasitic capacitance. However, the multiple-triggering effect in the typical DTSCR device may cause undesirable larger overall trigger voltage, which results in a reduced ESD safe margin. In previous research, the major cause is attributed to the higher current level required in the intrinsic SCR. The related discussions indicate that it seems to result from the current division rule between the intrinsic and parasitic SCR formed in the triggering process. In this letter, inserting a large space into the trigger diodes is proposed to get a deeper insight into this issue. The triggering current is observed to be regularly reduced along with the increased space, which confirms that the current division is determined by the parasitic resistance distributed between the intrinsic and parasitic SCR paths. The theoretical analysis is well confirmed by device simulation and transmission line pulse (TLP) test results. The reduced overall trigger voltage is achieved in the modified DTSCR structures due to the comprehensive result of the parasitic resistance vs triggering current, which indicates a minimized multiple-triggering effect. Project supported by the Beijing Natural Science Foundation, China (No. 4162030).

  10. Identifying Key Elements of Community-Based ESD: ESD-J's Projects to Collect ESD in Practice in Japan and Asia

    ERIC Educational Resources Information Center

    Noguchi, Fumiko

    2010-01-01

    Since its establishment in 2003, the Japan Council on the UN Decade of Education for Sustainable Development (ESD-J) has paid close attention to informal learning processes in community-based efforts to promote local sustainable development. ESD-J carried out two projects to collect information on and visualise community-based ESD practice: the…

  11. Protective Socket For Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Wilkinson, Chris; Henegar, Greg

    1988-01-01

    Socket for intergrated circuits (IC's) protects from excessive voltages and currents or from application of voltages and currents in wrong sequence during insertion or removal. Contains built-in switch that opens as IC removed, disconnecting leads from signals and power. Also protects other components on circuit board from transients produced by insertion and removal of IC. Makes unnecessary to turn off power to entire circuit board so other circuits on board continue to function.

  12. Experimental study of hybrid-knife endoscopic submucosal dissection (ESD) versus standard ESD in a Western country.

    PubMed

    De-la-Peña, Joaquín; Calderón, Ángel; Esteban, José Miguel; López-Rosés, Leopoldo; Martínez-Ares, David; Nogales, Óscar; Orive-Calzada, Aitor; Rodríguez, Sarbelio; Sánchez-Hernández, Eloy; Vila, Juan; Fernández-Esparrach, Gloria

    2014-02-01

    Endoscopic submucosal dissection (ESD) is an effective but time-consuming treatment for early neoplasia that requires a high level of expertise. The objective of this study was to assess the efficacy and learning curve of gastric ESD with a hybrid knife with high pressure water jet and to compare with standard ESD. We performed a prospective non survival animal study comparing hybrid-knife and standard gastric ESD. Variables recorded were: Number of en-bloc ESD, number of ESD with all marks included (R0), size of specimens, time and speed of dissection and adverse events. Ten endoscopists performed a total of 50 gastric ESD (30 hybrid-knife and 20 standard). Forty-six (92 %) ESD were en-bloc and 25 (50 %) R0 (hybrid-knife: n = 13, 44 %; standard: n = 16, 80 %; p = 0.04). Hybrid-knife ESD was faster than standard (time: 44.6 +/- 21.4 minutes vs. 68.7 +/- 33.5 minutes; p = 0.009 and velocity: 20.8 +/- 9.2 mm(2)/min vs. 14.3 +/- 9.3 mm(2)/min (p = 0.079). Adverse events were not different. There was no change in speed with any of two techniques (hybrid-knife: From 20.33 +/- 15.68 to 28.18 +/- 20.07 mm(2)/min; p = 0.615 and standard: From 6.4 +/- 0.3 to 19.48 +/- 19.21 mm(2)/min; p = 0.607). The learning curve showed a significant improvement in R0 rate in the hybrid-knife group (from 30 % to 100 %). despite the initial performance of hybrid-knife ESD is worse than standard ESD, the learning curve with hybrid knife ESD is short and is associated with a rapid improvement. The introduction of new tools to facilitate ESD should be implemented with caution in order to avoid a negative impact on the results.

  13. 30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... Equipment-General § 75.518 Electric equipment and circuits; overload and short circuit protection... installed so as to protect all electric equipment and circuits against short circuit and overloads. Three...

  14. 30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION... circuits; overload and short-circuit protection. Automatic circuit-breaking devices or fuses of the correct type and capacity shall be installed so as to protect all electric equipment and circuits against short...

  15. Electroshock protection circuit

    NASA Technical Reports Server (NTRS)

    Heskett, H.; Meincer, J.; Inglis, A. L.

    1973-01-01

    Circuit was developed to prevent accidental shock through electrodes used to test subjects as part of Skylab program. This circuit is placed between electrical apparatus and electrode that is attached to patient's body. Thus, patient is effectively protected from dangerous electrical shock that might be caused by failure in electrical apparatus.

  16. Reconfigurable ultra-thin film GDNMOS device for ESD protection in 28 nm FD-SOI technology

    NASA Astrophysics Data System (ADS)

    Athanasiou, Sotirios; Legrand, Charles-Alexandre; Cristoloveanu, Sorin; Galy, Philippe

    2017-02-01

    We propose a novel ESD protection device (GDNMOS: Gated Diode merged NMOS) fabricated with 28 nm UTBB FD-SOI high-k metal gate technology. By modifying the combination of the diode and transistor gate stacks, the robustness of the device is optimized, achieving a maximum breakdown voltage (VBR) of 4.9 V. In addition, modifications of the gate length modulate the trigger voltage (Vt1) with a minimum value of 3.5 V. Variable electrostatic doping (gate-induced) in diode and transistor body enables reconfigurable operation. A lower doping of the base enhances the bipolar gain, leading to thyristor behavior. This innovative architecture demonstrates excellent capability for high-voltage protection while maintaining a latch-up free behavior.

  17. ESD Protective Material and Equipment: A Critical Review

    DTIC Science & Technology

    1982-04-01

    having touched it. It is also of utmost importance that the resistivity of the work surface not change appreciably with changes in temperature , humidity...settings, e.g., temperature . No attempt was made to estimate the relative ease of heat-sealability of the bag materials, all of which use polyethylene...weapon in the battle against ESD. They function in two different ways. First, they reduce the materials’ coefficient of friction by increasing surface

  18. Protection circuits for very high frequency ultrasound systems.

    PubMed

    Choi, Hojong; Shung, K Kirk

    2014-04-01

    The purpose of protection circuits in ultrasound applications is to block noise signals from the transmitter from reaching the transducer and also to prevent unwanted high voltage signals from reaching the receiver. The protection circuit using a resistor and diode pair is widely used due to its simple architecture, however, it may not be suitable for very high frequency (VHF) ultrasound transducer applications (>100 MHz) because of its limited bandwidth. Therefore, a protection circuit using MOSFET devices with unique structure is proposed in this paper. The performance of the designed protection circuit was compared with that of other traditional protection schemes. The performance characteristics measured were the insertion loss (IL), total harmonic distortion (THD) and transient response time (TRT). The new protection scheme offers the lowest IL (-1.0 dB), THD (-69.8 dB) and TRT (78 ns) at 120 MHz. The pulse-echo response using a 120 MHz LiNbO3 transducer with each protection circuit was measured to validate the feasibility of the protection circuits in VHF ultrasound applications. The sensitivity and bandwidth of the transducer using the new protection circuit improved by 252.1 and 50.9 %, respectively with respect to the protection circuit using a resistor and diode pair. These results demonstrated that the new protection circuit design minimizes the IL, THD and TRT for VHF ultrasound transducer applications.

  19. Protection Circuits for Very High Frequency Ultrasound Systems

    PubMed Central

    Shung, K. Kirk

    2014-01-01

    The purpose of protection circuits in ultrasound applications is to block noise signals from the transmitter from reaching the transducer and also to prevent unwanted high voltage signals from reaching the receiver. The protection circuit using a resistor and diode pair is widely used due to its simple architecture, however, it may not be suitable for very high frequency (VHF) ultrasound transducer applications (>100 MHz) because of its limited bandwidth. Therefore, a protection circuit using MOSFET devices with unique structure is proposed in this paper. The performance of the designed protection circuit was compared with that of other traditional protection schemes. The performance characteristics measured were the insertion loss (IL), total harmonic distortion (THD) and transient response time (TRT). The new protection scheme offers the lowest IL (−1.0 dB), THD (−69.8 dB) and TRT (78 ns) at 120 MHz. The pulse-echo response using a 120 MHz LiNbO3 transducer with each protection circuit was measured to validate the feasibility of the protection circuits in VHF ultrasound applications. The sensitivity and bandwidth of the transducer using the new protection circuit improved by 252.1 and 50.9 %, respectively with respect to the protection circuit using a resistor and diode pair. These results demonstrated that the new protection circuit design minimizes the IL, THD and TRT for VHF ultrasound transducer applications. PMID:24682684

  20. 46 CFR 28.365 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... a steering circuit, each circuit must be protected against both overload and short circuit. Each overcurrent device in a steering system power and control circuit must provide short circuit protection only... 46 Shipping 1 2010-10-01 2010-10-01 false Overcurrent protection and switched circuits. 28.365...

  1. 30 CFR 75.601-1 - Short circuit protection; ratings and settings of circuit breakers.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Trailing Cables § 75.601-1 Short circuit protection; ratings and settings of circuit breakers. Circuit breakers providing short circuit protection for trailing cables shall be set so as not to exceed the...

  2. The low incidence of bacteremia after esophageal endoscopic submucosal dissection (ESD) obviates the need for prophylactic antibiotics in esophageal ESD.

    PubMed

    Kawata, Noboru; Tanaka, Masaki; Kakushima, Naomi; Takizawa, Kohei; Imai, Kenichiro; Hotta, Kinichi; Matsubayashi, Hiroyuki; Tsukahara, Mika; Kawamura, Ichiro; Kurai, Hanako; Ono, Hiroyuki

    2016-11-01

    Although a high incidence of bacteremia after esophageal endoscopic procedures has been reported, the incidence of bacteremia associated with esophageal endoscopic submucosal dissection (ESD) remains unknown. Therefore, we investigated the incidence of bacteremia associated with esophageal ESD. From April 2013 to March 2014, patients who underwent esophageal ESD were enrolled prospectively. Two sets of blood cultures were collected from patients at the following time points: (1) immediately after ESD; (2) the next morning; and (3) when fever ≥38 °C was present after ESD. A total of 424 blood culture sets were collected from 101 patients. Six patients had positive blood cultures immediately after ESD (4 %, 7/202 sets). Another patient had a positive blood culture the next morning (0.5 %, 1/202 sets). Ten patients (10 %) developed a post-ESD fever ≥38 °C, and blood cultures from these patients were all negative (0/20 sets). The seven patients with positive blood cultures had no post-ESD fever or infectious symptoms. Growth of Bacteroides thetaiotaomicron was only observed in one patient (1 %) with positive blood cultures immediately after ESD, and this patient was diagnosed with transient bacteremia. The other six patients were considered to have contaminants in their blood cultures. Thus, the incidence of bacteremia after esophageal ESD was 1 % [95 % confidence interval (CI) 0-5 %]. No patient had infectious symptoms, and none required antibiotics after ESD. The incidence of bacteremia after esophageal ESD was low and post-ESD fever was not associated with bacteremia. We conclude that use of routine prophylactic antibiotics to patients undergoing esophageal ESD is unnecessary. UMIN000012908.

  3. Overload protection circuit for output driver

    DOEpatents

    Stewart, Roger G.

    1982-05-11

    A protection circuit for preventing excessive power dissipation in an output transistor whose conduction path is connected between a power terminal and an output terminal. The protection circuit includes means for sensing the application of a turn on signal to the output transistor and the voltage at the output terminal. When the turn on signal is maintained for a period of time greater than a given period without the voltage at the output terminal reaching a predetermined value, the protection circuit decreases the turn on signal to, and the current conduction through, the output transistor.

  4. Consulting the UK ESD Community on an ESD Indicator to Recommend to Government: An Insight into the Micro-Politics of ESD

    ERIC Educational Resources Information Center

    Huckle, John

    2009-01-01

    In 2006 the author was contracted to research possible approaches to a UK indicator of education for sustainable development (ESD). This article describes and seeks to explain the response of government advisers and influential members of the UK ESD community to the approaches he proposed. While the UK strategy for sustainable development called…

  5. 30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY...-1 Electric equipment and circuits; overload and short circuit protection; minimum requirements. Devices providing either short circuit protection or protection against overload shall conform to the...

  6. 30 CFR 56.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Short circuit and lightning protection. 56... Electricity § 56.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  7. 30 CFR 56.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Short circuit and lightning protection. 56... Electricity § 56.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  8. 30 CFR 56.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Short circuit and lightning protection. 56... Electricity § 56.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  9. 30 CFR 56.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Short circuit and lightning protection. 56... Electricity § 56.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  10. 30 CFR 56.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Short circuit and lightning protection. 56... Electricity § 56.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  11. Circuits Protect Against Incorrect Power Connections

    NASA Technical Reports Server (NTRS)

    Delombard, Richard

    1992-01-01

    Simple circuits prevent application of incorrectly polarized or excessive voltages. Connected temporarily or permanently at power-connecting terminals. Devised to protect electrical and electronic equipment installed in spacecraft and subjected to variety of tests in different facilities prior to installation. Basic concept of protective circuits also applied easily to many kinds of electrical and electronic equipment that must be protected against incorrect power connections.

  12. 30 CFR 57.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Short circuit and lightning protection. 57... MINES Electricity Surface Only § 57.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  13. 30 CFR 57.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Short circuit and lightning protection. 57... MINES Electricity Surface Only § 57.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  14. 30 CFR 57.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Short circuit and lightning protection. 57... MINES Electricity Surface Only § 57.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  15. 30 CFR 57.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Short circuit and lightning protection. 57... MINES Electricity Surface Only § 57.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  16. 30 CFR 57.12065 - Short circuit and lightning protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Short circuit and lightning protection. 57... MINES Electricity Surface Only § 57.12065 Short circuit and lightning protection. Powerlines, including trolley wires, and telephone circuits shall be protected against short circuits and lightning. ...

  17. High performance protection circuit for power electronics applications

    NASA Astrophysics Data System (ADS)

    Tudoran, Cristian D.; Dǎdârlat, Dorin N.; Toşa, Nicoleta; Mişan, Ioan

    2015-12-01

    In this paper we present a high performance protection circuit designed for the power electronics applications where the load currents can increase rapidly and exceed the maximum allowed values, like in the case of high frequency induction heating inverters or high frequency plasma generators. The protection circuit is based on a microcontroller and can be adapted for use on single-phase or three-phase power systems. Its versatility comes from the fact that the circuit can communicate with the protected system, having the role of a "sensor" or it can interrupt the power supply for protection, in this case functioning as an external, independent protection circuit.

  18. 30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY... short circuit protection; minimum requirements. A device to provide either short circuit protection or...

  19. High performance protection circuit for power electronics applications

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Tudoran, Cristian D., E-mail: cristian.tudoran@itim-cj.ro; Dădârlat, Dorin N.; Toşa, Nicoleta

    2015-12-23

    In this paper we present a high performance protection circuit designed for the power electronics applications where the load currents can increase rapidly and exceed the maximum allowed values, like in the case of high frequency induction heating inverters or high frequency plasma generators. The protection circuit is based on a microcontroller and can be adapted for use on single-phase or three-phase power systems. Its versatility comes from the fact that the circuit can communicate with the protected system, having the role of a “sensor” or it can interrupt the power supply for protection, in this case functioning as anmore » external, independent protection circuit.« less

  20. Circuit compliance compensation in lung protective ventilation.

    PubMed

    Masselli, Grazia Maria Pia; Silvestri, Sergio; Sciuto, Salvatore Andrea; Cappa, Paolo

    2006-01-01

    Lung protective ventilation utilizes low tidal volumes to ventilate patients with severe lung pathologies. The compensation of breathing circuit effects, i.e. those induced by compressible volume of the circuit, results particularly critical in the calculation of the actual tidal volume delivered to patient's respiratory system which in turns is responsible of the level of permissive hypercapnia. The present work analyzes the applicability of the equation for circuit compressible volume compensation in the case of pressure and volume controlled lung protective ventilation. Experimental tests conducted in-vitro show that the actual tidal volume can be reliably estimated if the compliance of the breathing circuit is measured with the same parameters and ventilation technique that will be utilized in lung protective ventilation. Differences between volume and pressure controlled ventilation are also quantitatively assessed showing that pressure controlled ventilation allows a more reliable compensation of breathing circuit compressible volume.

  1. Critical Review of the ECSS-E-ST-20-07C ESD Test Set-Up for Testing Spacecraft Equipment

    NASA Astrophysics Data System (ADS)

    Pelissou, P.; Daout, B.; Romero, C.; Wolf, K.-F. J.

    2016-05-01

    Satellite equipment needs to be immune to electrostatic discharges (ESD) likely to occur in flight. Testing the susceptibility against ESD on spacecraft equipment is therefore an important part of the EMC test program. The test method according to ECSS-E-ST- 20-07C [1], which is commonly used in space industry, leaves undesirable degrees of freedom on how the test is performed, which in turn has an influence on the injected current and therefore on the test results. Because of the indirect coupling of ESD to circuits, the current waveform applied during the test and its repeatability are of high importance. In the frame of an ESTEC research contract (4000109887/13/NL/GLC), a critical review of the ECSS-E-ST-20-07C is performed to identify the influence factors which have an impact on the test repeatability.

  2. High Current ESD Test of Advanced Triple Junction Solar Array Coupon

    NASA Technical Reports Server (NTRS)

    Wright, Kenneth H., Jr.; Schneider, Todd A.; Vaughn, Jason A.; Hoang, Bao; Wong, Frankie

    2014-01-01

    Testing was conducted on an Advanced Triple Junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by Space Systems Loral, LLC (SSL). The ATJ coupon was a small, 4-cell, two-string configuration of flight-type design that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The objective of the present test was to evaluate the performance of the coupon after being subjected to induced electrostatic discharge (ESD) testing at two string voltages (100 V, 150 V) and four string currents (1.65 A, 2.0 A, 2.475 A, and 3.3 A). An ESD test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc flashover circuitry. A total of 73 primary arcs were obtained that included 7 temporary sustained arcs (TSA) events. The durations of the TSAs ranged from 50 micro-seconds to 2.75 milli-seconds. All TSAs occurred at a string voltage of 150 V. Post-ESD functional testing showed that no degradation occurred due to the TSA events. These test results point to a robust design for application to a high-current, high-power mission.

  3. Improved Short-Circuit Protection for Power Cells in Series

    NASA Technical Reports Server (NTRS)

    Davies, Francis

    2008-01-01

    A scheme for protection against short circuits has been devised for series strings of lithium electrochemical cells that contain built-in short-circuit protection devices, which go into a high-resistance, current-limiting state when heated by excessive current. If cells are simply connected in a long series string to obtain a high voltage and a short circuit occurs, whichever short-circuit protection device trips first is exposed to nearly the full string voltage, which, typically, is large enough to damage the device. Depending on the specific cell design, the damage can defeat the protective function, cause a dangerous internal short circuit in the affected cell, and/or cascade to other cells. In the present scheme, reverse diodes rated at a suitably high current are connected across short series sub-strings, the lengths of which are chosen so that when a short-circuit protection device is tripped, the voltage across it does not exceed its rated voltage. This scheme preserves the resetting properties of the protective devices. It provides for bypassing of cells that fail open and limits cell reversal, though not as well as does the more-expensive scheme of connecting a diode across every cell.

  4. Imaging indicator for ESD safety testing.

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Whinnery, LeRoy L.,; Nissen, April; Keifer, Patrick N.

    2013-05-01

    This report describes the development of a new detection method for electrostatic discharge (ESD) testing of explosives, using a single-lens reflex (SLR) digital camera and a 200-mm macro lens. This method has demonstrated several distinct advantages to other current ESD detection methods, including the creation of a permanent record, an enlarged image for real-time viewing as well as extended periods of review, and ability to combine with most other Go/No-Go sensors. This report includes details of the method, including camera settings and position, and results with wellcharacterized explosives PETN and RDX, and two ESD-sensitive aluminum powders.

  5. 30 CFR 75.601 - Short circuit protection of trailing cables.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Short circuit protection of trailing cables. 75... MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Trailing Cables § 75.601 Short circuit protection of trailing cables. [Statutory Provisions] Short circuit protection for trailing cables...

  6. 30 CFR 77.600 - Trailing cables; short-circuit protection; disconnecting devices.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Trailing cables; short-circuit protection... AREAS OF UNDERGROUND COAL MINES Trailing Cables § 77.600 Trailing cables; short-circuit protection; disconnecting devices. Short-circuit protection for trailing cables shall be provided by an automatic circuit...

  7. A Priority for ESD Research: Influencing Adult Citizens

    ERIC Educational Resources Information Center

    Monroe, Martha C.

    2007-01-01

    Research in the disciplines of education, science education, and environmental education has a rich history. While research in Education for Sustainable Development (ESD) may be related to these traditions, there is a need for ESD to carve a new niche that promotes high quality and effective ESD programmes. With an eye towards practice and applied…

  8. Can ESD Reach the Year 2020?

    ERIC Educational Resources Information Center

    Lenglet, Frans

    2014-01-01

    In order to have long-term impact ESD concepts, practices and policies should move into societal, policy and research arenas with high visibility and traction. In the process of going "transboundary", the ESD label may fade but the practice and organization of social and collaborative learning may gain.

  9. ESD robustness improving for the low-voltage triggering silicon-controlled rectifier by adding NWell at cathode

    NASA Astrophysics Data System (ADS)

    Jin, Xiangliang; Zheng, Yifei; Wang, Yang; Guan, Jian; Hao, Shanwan; Li, Kan; Luo, Jun

    2018-01-01

    The low-voltage triggering silicon-controlled rectifier (LVTSCR) device is widely used in on-chip electrostatic discharge (ESD) protection owing to its low trigger voltage and strong current-tolerating capability per area. In this paper, an improved LVTSCR by adding a narrow NWell (NW2) under the source region of NMOS is discussed, which is realized in a 0.5-μm CMOS process. A 2-dimension (2D) device simulation platform and a transmission line pulse (TLP) testing system are used to predict and characterize the proposed ESD protection devices. According to the measurement results, compared with the preliminary LVTSCR, the improved LVTSCR elevates the second breakdown current (It2) from 2.39 A to 5.54 A and increases the holding voltage (Vh) from 3.04 V to 4.09 V without expanding device area or sacrificing any ESD performances. Furthermore, the influence of the size of the narrow NWell under the source region of NMOS on holding voltage is also discussed.

  10. ESD prevention, combating ESD problem — Solutions

    NASA Astrophysics Data System (ADS)

    Duban, M.

    2002-12-01

    In today's Electronic equipment manufacturing, managing an ESD (Electro static Discharge) plan is an integral part of a complete quality program. Every body has been in presence of static electricity one day or an other. But a discharge on a body of man is only felt when the potential of charge before the discharge is higher than 3000 volts but components can have a sensitivity less than 20 Volts !

  11. Crossed SMPS MOSFET-based protection circuit for high frequency ultrasound transceivers and transducers.

    PubMed

    Choi, Hojong; Shung, K Kirk

    2014-06-12

    The ultrasonic transducer is one of the core components of ultrasound systems, and the transducer's sensitivity is significantly related the loss of electronic components such as the transmitter, receiver, and protection circuit. In an ultrasonic device, protection circuits are commonly used to isolate the electrical noise between an ultrasound transmitter and transducer and to minimize unwanted discharged pulses in order to protect the ultrasound receiver. However, the performance of the protection circuit and transceiver obviously degrade as the operating frequency or voltage increases. We therefore developed a crossed SMPS (Switching Mode Power Supply) MOSFET-based protection circuit in order to maximize the sensitivity of high frequency transducers in ultrasound systems.The high frequency pulse signals need to trigger the transducer, and high frequency pulse signals must be received by the transducer. We therefore selected the SMPS MOSFET, which is the main component of the protection circuit, to minimize the loss in high frequency operation. The crossed configuration of the protection circuit can drive balanced bipolar high voltage signals from the pulser and transfer the balanced low voltage echo signals from the transducer. The equivalent circuit models of the SMPS MOSFET-based protection circuit are shown in order to select the proper device components. The schematic diagram and operation mechanism of the protection circuit is provided to show how the protection circuit is constructed. The P-Spice circuit simulation was also performed in order to estimate the performance of the crossed MOSFET-based protection circuit. We compared the performance of our crossed SMPS MOSFET-based protection circuit with a commercial diode-based protection circuit. At 60 MHz, our expander and limiter circuits have lower insertion loss than the commercial diode-based circuits. The pulse-echo test is typical method to evaluate the sensitivity of ultrasonic transducers

  12. Short circuit protection for a power distribution system

    NASA Technical Reports Server (NTRS)

    Owen, J. R., III

    1969-01-01

    Sensing circuit detects when the output from a matrix is present and when it should be present. The circuit provides short circuit protection for a power distribution system where the selection of the driven load is accomplished by digital logic.

  13. Crossed SMPS MOSFET-based protection circuit for high frequency ultrasound transceivers and transducers

    PubMed Central

    2014-01-01

    Background The ultrasonic transducer is one of the core components of ultrasound systems, and the transducer’s sensitivity is significantly related the loss of electronic components such as the transmitter, receiver, and protection circuit. In an ultrasonic device, protection circuits are commonly used to isolate the electrical noise between an ultrasound transmitter and transducer and to minimize unwanted discharged pulses in order to protect the ultrasound receiver. However, the performance of the protection circuit and transceiver obviously degrade as the operating frequency or voltage increases. We therefore developed a crossed SMPS (Switching Mode Power Supply) MOSFET-based protection circuit in order to maximize the sensitivity of high frequency transducers in ultrasound systems. The high frequency pulse signals need to trigger the transducer, and high frequency pulse signals must be received by the transducer. We therefore selected the SMPS MOSFET, which is the main component of the protection circuit, to minimize the loss in high frequency operation. The crossed configuration of the protection circuit can drive balanced bipolar high voltage signals from the pulser and transfer the balanced low voltage echo signals from the transducer. Methods The equivalent circuit models of the SMPS MOSFET-based protection circuit are shown in order to select the proper device components. The schematic diagram and operation mechanism of the protection circuit is provided to show how the protection circuit is constructed. The P-Spice circuit simulation was also performed in order to estimate the performance of the crossed MOSFET-based protection circuit. Results We compared the performance of our crossed SMPS MOSFET-based protection circuit with a commercial diode-based protection circuit. At 60 MHz, our expander and limiter circuits have lower insertion loss than the commercial diode-based circuits. The pulse-echo test is typical method to evaluate the sensitivity of

  14. Step-up training for colorectal and gastric ESD and the challenge of ESD training in the proximal colon: results from a German Center.

    PubMed

    Ebigbo, Alanna; Probst, Andreas; Römmele, Christoph; Messmann, Helmut

    2018-05-01

    The endoscopic submucosal dissection (ESD) of cancerous and precancerous lesions in the gastrointestinal (GI) tract is an effective but difficult-to-learn procedure, especially for Western endoscopists. We developed a step-up training protocol and evaluated its outcome on a single endoscopist using specific performance measures. The training protocol included a 12-month period of 50 observational and supervised ESD cases as well as 24 animal procedures. After completion of the protocol, ESD competency was evaluated in the first 30 independent ESD cases. Majority of lesions were located in the stomach and rectum. Performance measures included R0-resection rate, complication rate and resection speed. R0 resection rate was 93 %, complication rate was 7 % and median resection speed was 6,77 cm 2 /h. 1 case of delayed perforation with subsequent hemicolectomy occurred in the descending colon. The ESD step-up training protocol used in this study on a single endoscopist showed excellent outcomes for lesions in the rectum and stomach. However, ESD training in the upper colon remains a challenge.

  15. 14 CFR 25.1357 - Circuit protective devices.

    Code of Federal Regulations, 2013 CFR

    2013-01-01

    ... designed to de-energize and disconnect faulty power sources and power transmission equipment from their... malfunctioning. (c) Each resettable circuit protective device must be designed so that, when an overload or... must be designed so that circuit breakers are not the primary means to remove or reset system power...

  16. 14 CFR 25.1357 - Circuit protective devices.

    Code of Federal Regulations, 2012 CFR

    2012-01-01

    ... designed to de-energize and disconnect faulty power sources and power transmission equipment from their... malfunctioning. (c) Each resettable circuit protective device must be designed so that, when an overload or... must be designed so that circuit breakers are not the primary means to remove or reset system power...

  17. 14 CFR 29.1357 - Circuit protective devices.

    Code of Federal Regulations, 2013 CFR

    2013-01-01

    ... devices in the generating system must be designed to de-energize and disconnect faulty power sources and power transmission equipment from their associated buses with sufficient rapidity to provide protection... be designed so that, when an overload or circuit fault exists, it will open the circuit regardless of...

  18. 14 CFR 25.1357 - Circuit protective devices.

    Code of Federal Regulations, 2014 CFR

    2014-01-01

    ... designed to de-energize and disconnect faulty power sources and power transmission equipment from their... malfunctioning. (c) Each resettable circuit protective device must be designed so that, when an overload or... must be designed so that circuit breakers are not the primary means to remove or reset system power...

  19. 14 CFR 29.1357 - Circuit protective devices.

    Code of Federal Regulations, 2014 CFR

    2014-01-01

    ... devices in the generating system must be designed to de-energize and disconnect faulty power sources and power transmission equipment from their associated buses with sufficient rapidity to provide protection... be designed so that, when an overload or circuit fault exists, it will open the circuit regardless of...

  20. 14 CFR 29.1357 - Circuit protective devices.

    Code of Federal Regulations, 2011 CFR

    2011-01-01

    ... devices in the generating system must be designed to de-energize and disconnect faulty power sources and power transmission equipment from their associated buses with sufficient rapidity to provide protection... be designed so that, when an overload or circuit fault exists, it will open the circuit regardless of...

  1. 14 CFR 29.1357 - Circuit protective devices.

    Code of Federal Regulations, 2012 CFR

    2012-01-01

    ... devices in the generating system must be designed to de-energize and disconnect faulty power sources and power transmission equipment from their associated buses with sufficient rapidity to provide protection... be designed so that, when an overload or circuit fault exists, it will open the circuit regardless of...

  2. 14 CFR 25.1357 - Circuit protective devices.

    Code of Federal Regulations, 2011 CFR

    2011-01-01

    ... designed to de-energize and disconnect faulty power sources and power transmission equipment from their... malfunctioning. (c) Each resettable circuit protective device must be designed so that, when an overload or... must be designed so that circuit breakers are not the primary means to remove or reset system power...

  3. A Case-Control Study of Esomeprazole Plus Rebamipide vs. Omeprazole Plus Rebamipide on Post-ESD Gastric Ulcers.

    PubMed

    Bunno, Maki; Gouda, Kyosuke; Yamahara, Kunihiro; Kawaguchi, Masanori

    2013-01-01

    Endoscopic submucosal dissection (ESD) is useful for treating gastric tumors. Several trials have shown the efficacy of 4 or 8 weeks of proton pump inhibitor (PPI) administration for post-ESD ulcers. However, if the size of the post-ESD ulcer is larger than predicted, PPI administration alone might not be sufficient for the ulcer to heal within 4 weeks. There is no report about the efficacy of post-ESD gastric ulcers by esomeprazole. We examined retrospectively the efficacy of a combination therapy of esomeprazole plus rebamipide, a mucosal-protective antiulcer drug, on the acceleration of post-ESD ulcer healing comparing with omeprazole plus rebamipide. We reviewed the medical records of patients who underwent ESD for gastric neoplasia. We conducted a case-control study to compare the healing rates within 4 weeks effected by esomeprazole plus rebamipide (group E) and omeprazole plus rebamipide (group O). The sizes of the artificial ulcers were divided into normal-sized or large-sized. The baseline characteristics did not differ significantly between the two groups except age and sex. Stage S1 disease was observed in 27.6% and 38.7% of patients after 4 weeks of treatment in the group E and O, respectively. In large-sized artificial ulcers, the healing rate of stage S1 in group E is significantly higher than that in group O in 4 weeks.(25% VS 0%:P = 0.02). The safety and efficacy profiles of esomeprazole plus rebamipide and omeprazole and rebamipide are similar for the treatment of ESD-induced ulcers. In large-sized ulcers, esomeprazole plus rebamipide promotes ulcer healing.

  4. 30 CFR 57.12001 - Circuit overload protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

  5. 30 CFR 57.12001 - Circuit overload protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

  6. 30 CFR 57.12001 - Circuit overload protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

  7. 30 CFR 57.12001 - Circuit overload protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

  8. 30 CFR 57.12001 - Circuit overload protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit overload protection. 57.12001 Section 57.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-UNDERGROUND METAL AND NONMETAL MINES Electricity Surface and Underground § 57.12001 Circuit...

  9. 30 CFR 75.802 - Protection of high-voltage circuits extending underground.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Protection of high-voltage circuits extending...-Voltage Distribution § 75.802 Protection of high-voltage circuits extending underground. (a) Except as provided in paragraph (b) of this section, high-voltage circuits extending underground and supplying...

  10. 30 CFR 75.802 - Protection of high-voltage circuits extending underground.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Protection of high-voltage circuits extending...-Voltage Distribution § 75.802 Protection of high-voltage circuits extending underground. (a) Except as provided in paragraph (b) of this section, high-voltage circuits extending underground and supplying...

  11. 30 CFR 75.802 - Protection of high-voltage circuits extending underground.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Protection of high-voltage circuits extending...-Voltage Distribution § 75.802 Protection of high-voltage circuits extending underground. (a) Except as provided in paragraph (b) of this section, high-voltage circuits extending underground and supplying...

  12. ESD testing of the 8S actuator (u)

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Mchugh, Douglas C

    2010-12-03

    The 8S actuator is a hot-wire initiated explosive component used to drive the W76-1 2X Acorn 1V valve. It is known to be safe from human electrostatic discharge (ESD) pin-to-pin and all pin-to-cup stimuli as well as 1 amp/1 watt safe. However low impedance (furniture) ESD stimuli applied pin-to-pin has not been evaluated. Components were tested and the results analyzed. The 8S actuator has been shown to be immune to human and severe furniture ESD, whether applied pin-to-pin or pin-to-cup.

  13. 30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

  14. 30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

  15. 30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

  16. 30 CFR 75.518 - Electric equipment and circuits; overload and short circuit protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short circuit protection. 75.518 Section 75.518 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518 Electric...

  17. Recycle dynamics during centrifugal compressor ESD, start-up and surge control

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Botros, K.K.; Jones, B.J.; Richards, D.J.

    1996-12-31

    Recycle systems are important components in the operation of centrifugal compressor stations. They are essential during a start-up operation, for surge protection and for emergency shutdown (ESD). These operations are inherently dynamic where interactions between equipment, control and gas flow occur in a complex manner with the associated risk of compressor surge. Of particular importance are the effects or recycle system capacity, the recycle valve characteristics, check valve dynamic behavior, piping geometry and capacitance around the compressor unit, and the performance characteristics of the centrifugal compressor itself. This paper presents numerical results of the effects of some of these parametersmore » on surge control, ESD and unit startup. These parameters are: (1) The effects of damping the surge control flow signal in an attempt to suppress the signal noise, on the integrity of the surge control system; (2) The effects of recycle valve characteristics, stroke time and valve capacity on ESD; (3) The effects of recycle line size on ESD; and (4) The effects of the recycle valve closing time (or rate) on the startup operation, with the intent of shortening this time to minimum for environmental reasons. Results were obtained from the solution of the pertinent dynamic equations describing the gas and equipment dynamics which has been verified against field and laboratory measurements. The samples presented in this paper were applied to a 24 MW natural gas compressor station on the NOVA Gas Transmission system, and to a scale-down laboratory model. Influence of other parameters from this investigation were published elsewhere and are cited in the reference section.« less

  18. 30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

  19. 30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

  20. 30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

  1. 30 CFR 77.506 - Electric equipment and circuits; overload and short-circuit protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short-circuit protection. 77.506 Section 77.506 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES...

  2. Challenges of Implementing ESD in the Education Sector; Experiences in Norway

    NASA Astrophysics Data System (ADS)

    Sandås, Astrid; Benedict, Faye

    This article presents and reflects on Norwegian experiences over a period of about 15 years with implementing the Norwegian national strategy for education for sustainable development (ESD) in the education system. We extract lessons about integration of ESD into education systems. After an introduction to central ideas of sustainable development and ESD, the article discusses the need for appropriate strategies and instruments. Key factors are collaboration to allow pupils and schools to actively contribute to a positive development locally and globally, interdisciplinary approaches to complex sustainability issues, and appropriate use of the ICT and other media. ESD programmes and activities should support school development and build the capacity of schools and teachers for integration of ESD.

  3. Circuit protects regulated power supply against overload current

    NASA Technical Reports Server (NTRS)

    Airth, H. B.

    1966-01-01

    Sensing circuit in which a tunnel diode controls a series regulator transistor protects a low voltage transistorized dc regulator from damage by excessive load currents. When a fault occurs, the faulty circuit is limited to a preset percentage of the current when limiting first occurs.

  4. 30 CFR 18.51 - Electrical protection of circuits and equipment.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... the junction with the main circuit when the branch-circuit conductor(s) has a current carrying... same duty. (1) If the overcurrent-protective device in a direct-current circuit does not open both... preventing the possibility of reversing connections which would result in changing the circuit interrupter to...

  5. 30 CFR 18.51 - Electrical protection of circuits and equipment.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... the junction with the main circuit when the branch-circuit conductor(s) has a current carrying... same duty. (1) If the overcurrent-protective device in a direct-current circuit does not open both... preventing the possibility of reversing connections which would result in changing the circuit interrupter to...

  6. Challenging the Focus of ESD: A Southern Perspective of ESD Guidelines

    ERIC Educational Resources Information Center

    de Andrade, Daniel Fonseca

    2011-01-01

    In parallel to the 2009 World Conference on Education for Sustainable Development held in Bonn, Germany, UNESCO organised a group of 25 young education for sustainable development (ESD)-engaged people from 25 countries to bring perceptions, demands, suggestions and contributions to the conference. Prior to the conference the group was divided into…

  7. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... current carrying conductor must be protected in accordance with its current carrying capacity by a circuit breaker or fuse at the connection to the switchboard or distribution panel bus. (d) Each circuit breaker...

  8. 46 CFR 28.860 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... current carrying conductor must be protected in accordance with its current carrying capacity by a circuit breaker or fuse at the connection to the switchboard or distribution panel bus. (d) Each circuit breaker...

  9. ESD Implementation at the School Organisation Level, Part 1--Investigating the Quality Criteria Guiding School Leaders' Work at Recognized ESD Schools

    ERIC Educational Resources Information Center

    Mogren, Anna; Gericke, Niklas

    2017-01-01

    Research on Education for Sustainable Development (ESD) implementation tends to focus primarily on student and teacher outcomes, and there have been few studies on leadership practices at the school organisation level that provide information on how quality in education contributes to ESD implementation. To address this issue, we conducted an…

  10. Drive and protection circuit for converter module of cascaded H-bridge STATCOM

    NASA Astrophysics Data System (ADS)

    Wang, Xuan; Yuan, Hongliang; Wang, Xiaoxing; Wang, Shuai; Fu, Yongsheng

    2018-04-01

    Drive and protection circuit is an important part of power electronics, which is related to safe and stable operation issues in the power electronics. The drive and protection circuit is designed for the cascaded H-bridge STATCOM. This circuit can realize flexible dead-time setting, operation status self-detection, fault priority protection and detailed fault status uploading. It can help to improve the reliability of STATCOM's operation. Finally, the proposed circuit is tested and analyzed by power electronic simulation software PSPICE (Simulation Program with IC Emphasis) and a series of experiments. Further studies showed that the proposed circuit can realize drive and control of H-bridge circuit, meanwhile it also can realize fast processing faults and have advantage of high reliability.

  11. Selection of wires and circuit protective devices for STS Orbiter vehicle payload electrical circuits

    NASA Technical Reports Server (NTRS)

    Gaston, Darilyn M.

    1991-01-01

    Electrical designers of Orbiter payloads face the challenge of determining proper circuit protection/wire size parameters to satisfy Orbiter engineering and safety requirements. This document is the result of a program undertaken to review test data from all available aerospace sources and perform additional testing to eliminate extrapolation errors. The resulting compilation of data was used to develop guidelines for the selection of wire sizes and circuit protection ratings. The purpose is to provide guidance to the engineering to ensure a design which meets Orbiter standards and which should be applicable to any aerospace design.

  12. KSC Electrostatic Discharge (ESD) Issues

    NASA Technical Reports Server (NTRS)

    Buhler, Charles

    2008-01-01

    Discussion of key electrostatic issues that have arisen during the past few years at KSC that the Electrostatics Laboratory has studied. The lab has studied in depth the Space Shuttle's Thermal Control System Blankets, the International Space Station Thermal Blanket, the Pan/Tilt Camera Blankets, the Kapton Purge Barrier Curtain, the Aclar Purge Barrier Curtain, the Thrust Vector Controller Blankets, the Tyvek Reaction Control System covers, the AID-PAK and FLU-9 pyro inflatable devices, the Velostat Solid Rocket Booster mats, and the SCAPE suits. In many cases these materials are insulating meaning that they might be a source of unsafe levels of electrostatic discharge (ESD). For each, the lab provided in-depth testing of each material within its current configuration to ensure that it does not cause an ESD concern that may violate the safety of the astronauts, the workers and equipment for NASA. For example the lab provides unique solutions and testing such as Spark Incendivity Testing that checks whether a material is capable of generating a spark strong enough to ignite a flammable gas. The lab makes recommendations to changes in specifications, procedures, and material if necessary. The lab also consults with a variety of non-safety related ESD issues for the agency.

  13. Electrostatic Discharge (ESD) Susceptibility of Electronic Devices

    DTIC Science & Technology

    1983-01-01

    determined by knowing the thermal environment in which the component is to operate. However, ESD is not that predictable . It is considered a random... predicted where a part may experience an ESD pulse during usage? (3) What effect does stressing a device with different models have on its propensity for...relatively low ESO threshold voltages (i.e., < 7000 volts) tend to be consistently high compared with their predicted level using EMP data. But at

  14. Fuse protects circuit from voltage and current overloads

    NASA Technical Reports Server (NTRS)

    Casey, L. O.

    1969-01-01

    Low-melting resistor connected in series with the load protects the circuit against current overloads. It protects test subjects and patients being monitored by electronic instrumentation from inadvertant overloads of current, and sensitive electronic equipment against high-voltage damage.

  15. Development of circuit model for arcing on solar panels

    NASA Astrophysics Data System (ADS)

    Mehta, Bhoomi K.; Deshpande, S. P.; Mukherjee, S.; Gupta, S. B.; Ranjan, M.; Rane, R.; Vaghela, N.; Acharya, V.; Sudhakar, M.; Sankaran, M.; Suresh, E. P.

    2010-02-01

    The increased requirements of payload capacity of the satellites have resulted in much higher power requirements of the satellites. In order to minimize the energy loss during power transmission due to cable loss, use of high voltage solar panels becomes necessary. When a satellite encounters space plasma it floats negatively with respect to the surrounding space plasma environment. At high voltage, charging and discharging on solar panels causes the power system breakdown. Once a solar panel surface is charged and potential difference between surface insulator and conductor exceeds certain value, electrostatic discharge (ESD) may occur. This ESD may trigger a secondary arc that can destroy the solar panel circuit. ESD is also called as primary or minor arc and secondary is called major arc. The energy of minor arc is supplied by the charge stored in the coverglass of solar array and is a pulse of typically several 100 ns to several 100 μs duration. The damage caused by minor arc is less compared to major arcs, but it is observed that the minor arc is cause of major arc. Therefore it is important to develop an understanding of minor arc and mitigation techniques. In this paper we present a linear circuit analysis for minor arcs on solar panels. To study arcing event, a ground experimental facility to simulate space plasma environment has been developed at Facilitation Centre for Industrial Plasma Technologies (Institute for Plasma Research) in collaboration with Indian Space Research Organization's ISRO Satellite Technology Centre (ISAC). A linear circuit model has been developed to explain the experimental results by representing the coverglass, solar cell interconnect and wiring by an LCR circuit and the primary arc by an equivalent LR circuit. The aim of the circuit analysis is to predict the arc current which flows through the arc plasma. It is established from the model that the current depends on various parameters like potential difference between insulator

  16. DC isolation and protection system and circuit

    NASA Technical Reports Server (NTRS)

    Wagner, Charles A. (Inventor); Kellogg, Gary V. (Inventor)

    1991-01-01

    A precision analog electronic circuit that is capable of sending accurate signals to an external device that has hostile electric characteristics, including the presence of very large common mode voltages. The circuit is also capable of surviving applications of normal mode overvoltages of up to 120 VAC/VDC for unlimited periods of time without damage or degradation. First, the circuit isolates the DC signal output from the computer. Means are then provided for amplifying the isolated DC signal. Further means are provided for stabilizing and protecting the isolating and amplifying means, and the isolated and amplified DC signal which is output to the external device, against overvoltages and overcurrents.

  17. 30 CFR 77.600 - Trailing cables; short-circuit protection; disconnecting devices.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... capacity in each ungrounded conductor. Disconnecting devices used to disconnect power from trailing cables... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Trailing cables; short-circuit protection... AREAS OF UNDERGROUND COAL MINES Trailing Cables § 77.600 Trailing cables; short-circuit protection...

  18. 30 CFR 77.600 - Trailing cables; short-circuit protection; disconnecting devices.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... capacity in each ungrounded conductor. Disconnecting devices used to disconnect power from trailing cables... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Trailing cables; short-circuit protection... AREAS OF UNDERGROUND COAL MINES Trailing Cables § 77.600 Trailing cables; short-circuit protection...

  19. 30 CFR 77.600 - Trailing cables; short-circuit protection; disconnecting devices.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... capacity in each ungrounded conductor. Disconnecting devices used to disconnect power from trailing cables... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Trailing cables; short-circuit protection... AREAS OF UNDERGROUND COAL MINES Trailing Cables § 77.600 Trailing cables; short-circuit protection...

  20. 30 CFR 77.600 - Trailing cables; short-circuit protection; disconnecting devices.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... capacity in each ungrounded conductor. Disconnecting devices used to disconnect power from trailing cables... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Trailing cables; short-circuit protection... AREAS OF UNDERGROUND COAL MINES Trailing Cables § 77.600 Trailing cables; short-circuit protection...

  1. 49 CFR 236.304 - Mechanical locking or same protection effected by circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Mechanical locking or same protection effected by..., AND APPLIANCES Interlocking Standards § 236.304 Mechanical locking or same protection effected by circuits. Mechanical locking, or the same protection effected by means of circuits, shall be provided. ...

  2. Endoscopic therapy for early gastric cancer: Standard techniques and recent advances in ESD

    PubMed Central

    Kume, Keiichiro

    2014-01-01

    The technique of endoscopic submucosal dissection (ESD) is now a well-known endoscopic therapy for early gastric cancer. ESD was introduced to resect large specimens of early gastric cancer in a single piece. ESD can provide precision of histologic diagnosis and can also reduce the recurrence rate. However, the drawback of ESD is its technical difficulty, and, consequently, it is associated with a high rate of complications, the need for advanced endoscopic techniques, and a lengthy procedure time. Various advances in the devices and techniques used for ESD have contributed to overcoming these drawbacks. PMID:24914364

  3. SRM propellant, friction/ESD testing

    NASA Technical Reports Server (NTRS)

    Campbell, L. A.

    1989-01-01

    Following the Pershing 2 incident in 1985 and the Peacekeeper ignition during core removal in 1987, it was found that propellant can be much more sensitive to Electrostatic Discharges (ESD) than ever before realized. As a result of the Peacekeeper motor near miss incident, a friction machine was designed and fabricated, and used to determine friction hazards during core removal. Friction testing with and electrical charge being applied across the friction plates resulted in propellant ignitions at low friction pressures and extremely low ESD levels. The objective of this test series was to determine the sensitivity of solid rocket propellant to combined friction pressure and electrostatic stimuli and to compare the sensitivity of the SRM propellant to Peacekeeper propellant. The tests are fully discussed, summarized and conclusions drawn.

  4. Saving Resources - Lesson plan of ESD in Geography

    NASA Astrophysics Data System (ADS)

    Iwamura, Takuya

    2010-05-01

    Geographical education has to perceive the world from diversified viewpoints by involving ESD (Education for Sustainable Development). This can be realized by teaching geography as an integrated science, including ESD that considers ecological, economic and social aspects.. In Japan especially, geographical education tends to emphasize the environmental aspects. The investigation of circumstances from diversified viewpoints helps to analyse the society scientifically and generates? the qualities of a global citizenship toward a sustainable society. And ESD aims at creating the values of sustainability, which is necessary for a global citizenship. In this context, I have developed the lesson plan of ESD in Geography at a secondary level.. Can advanced technologies foster sustainable development? The presentation shows the advanced technology-generated products and analyses the merits and failures with their effects on the global society. The examples of these products are hybrid cars and mobile phones. Cars are necessary for the mobility of our widespread modern society. On the other hand, it is also true that environmental pollution is becoming more serious by the increasing number of cars. We usually assume that economic development and environmental protection are contradictory. But hybrid cars which are coming to world attention now, have good gas mileage compared with normal cars, so they can conserve energy and cut down on the amount of exhaust at the same time. Mobile phones are necessary in business situations, as a tool that helps to communicate while moving. In addition, mobile phones are means that support the life of people living in sparsely populated areas like in Northern Europe. Here, we can curb costs for transmission facilities that were needed otherwise. There is one thing that underlies these advanced technology-generated products such as hybrid cars and mobile phones. The resource that makes the hybrid car technology and the miniaturization of

  5. ESD and Education for All: Synergies and Potential Conflicts

    ERIC Educational Resources Information Center

    Gadotti, Moacir

    2010-01-01

    This paper analyses how Education for Sustainable Development (ESD) can assist in increasing access to quality education and discusses how it can contribute to the content and learning methods on the Education for All (EFA) agenda. It explores both the tensions and the common ground between ESD and EFA, and identifies the potential synergies…

  6. 30 CFR 77.901 - Protection of low- and medium-voltage three-phase circuits.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Protection of low- and medium-voltage three... WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.901 Protection of low- and medium-voltage three-phase circuits. (a) Low- and medium-voltage circuits supplying...

  7. 30 CFR 77.901 - Protection of low- and medium-voltage three-phase circuits.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Protection of low- and medium-voltage three... WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.901 Protection of low- and medium-voltage three-phase circuits. (a) Low- and medium-voltage circuits supplying...

  8. 30 CFR 77.901 - Protection of low- and medium-voltage three-phase circuits.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Protection of low- and medium-voltage three... WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.901 Protection of low- and medium-voltage three-phase circuits. (a) Low- and medium-voltage circuits supplying...

  9. 30 CFR 77.901 - Protection of low- and medium-voltage three-phase circuits.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Protection of low- and medium-voltage three... WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.901 Protection of low- and medium-voltage three-phase circuits. (a) Low- and medium-voltage circuits supplying...

  10. 30 CFR 77.901 - Protection of low- and medium-voltage three-phase circuits.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Protection of low- and medium-voltage three... WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits § 77.901 Protection of low- and medium-voltage three-phase circuits. (a) Low- and medium-voltage circuits supplying...

  11. 14 CFR 25.1717 - Circuit protective devices: EWIS.

    Code of Federal Regulations, 2010 CFR

    2010-01-01

    ... AIRCRAFT AIRWORTHINESS STANDARDS: TRANSPORT CATEGORY AIRPLANES Electrical Wiring Interconnection Systems (EWIS) § 25.1717 Circuit protective devices: EWIS. Electrical wires and cables must be designed and...

  12. 30 CFR 75.518-2 - Incandescent lamps, overload and short circuit protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Incandescent lamps, overload and short circuit...-General § 75.518-2 Incandescent lamps, overload and short circuit protection. Incandescent lamps installed... or direct current feeder circuits, need not be provided with separate short circuit or overload...

  13. 30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

  14. 30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

  15. 30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

  16. 30 CFR 75.518-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 75.518-1 Section 75.518-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical...

  17. Exploration Systems Development (ESD) Approach to Enterprise Risk Management

    NASA Technical Reports Server (NTRS)

    Bauder, Stephen P.

    2014-01-01

    The National Aeronautics and Space Administration (NASA) Exploration Systems Development (ESD) Division has implemented an innovative approach to Enterprise Risk Management under a unique governance structure and streamlined integration model. ESD's mission is to design and build the capability to extend human existence to deep space. The Enterprise consists of three Programs: Space Launch System (SLS), Orion, and Ground Systems Development and Operations (GSDO). The SLS is a rocket and launch system that will be capable of powering humans, habitats, and support systems to deep space. Orion will be the first spacecraft in history capable of taking humans to multiple destinations within deep space. GSDO is modernizing Kennedy's spaceport to launch spacecraft built and designed by both NASA and private industry. ESD's approach to Enterprise Risk Management is commensurate with affordability and a streamlined management philosophy. ESD Enterprise Risk Management leverages off of the primary mechanisms for integration within the Enterprise. The Enterprise integration approach emphasizes delegation of authority to manage and execute the majority of cross-program activities and products to the individual Programs, while maintaining the overall responsibility for all cross-program activities at the Division. The intent of the ESD Enterprise Risk Management approach is to improve risk communication, to avoid replication and/or contradictory strategies, and to minimize overhead process burden. This is accomplished by the facilitation and integration of risk information within ESD. The ESD Division risks, Orion risks, SLS risks, and GSDO risks are owned and managed by the applicable Program. When the Programs have shared risks with multiple consequences, they are jointly owned and managed. When a risk is associated with the integrated system that involves more than one Program in condition, consequence, or mitigation plan, it is considered an Exploration Systems Integration

  18. 30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

  19. 30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

  20. 30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

  1. 30 CFR 77.506-1 - Electric equipment and circuits; overload and short circuit protection; minimum requirements.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Electric equipment and circuits; overload and short circuit protection; minimum requirements. 77.506-1 Section 77.506-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK AREAS O...

  2. Relay Protection and Automation Systems Based on Programmable Logic Integrated Circuits

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Lashin, A. V., E-mail: LashinAV@lhp.ru; Kozyrev, A. V.

    One of the most promising forms of developing the apparatus part of relay protection and automation devices is considered. The advantages of choosing programmable logic integrated circuits to obtain adaptive technological algorithms in power system protection and control systems are pointed out. The technical difficulties in the problems which today stand in the way of using relay protection and automation systems are indicated and a new technology for solving these problems is presented. Particular attention is devoted to the possibility of reconfiguring the logic of these devices, using programmable logic integrated circuits.

  3. 30 CFR 56.12001 - Circuit overload protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

  4. 30 CFR 56.12001 - Circuit overload protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

  5. 30 CFR 56.12001 - Circuit overload protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

  6. 30 CFR 56.12001 - Circuit overload protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

  7. 30 CFR 56.12001 - Circuit overload protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Circuit overload protection. 56.12001 Section 56.12001 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR METAL AND NONMETAL MINE SAFETY AND HEALTH SAFETY AND HEALTH STANDARDS-SURFACE METAL AND NONMETAL MINES Electricity...

  8. Base drive and overlap protection circuit

    DOEpatents

    Gritter, David J.

    1983-01-01

    An inverter (34) which provides power to an A. C. machine (28) is controlled by a circuit (36) employing PWM control strategy whereby A. C. power is supplied to the machine at a preselectable frequency and preselectable voltage. This is accomplished by the technique of waveform notching in which the shapes of the notches are varied to determine the average energy content of the overall waveform. Through this arrangement, the operational efficiency of the A. C. machine is optimized. The control circuit includes a microcomputer and memory element which receive various parametric inputs and calculate optimized machine control data signals therefrom. The control data is asynchronously loaded into the inverter through an intermediate buffer (38). A base drive and overlap protection circuit is included to insure that both transistors of a complimentary pair are not conducting at the same time. In its preferred embodiment, the present invention is incorporated within an electric vehicle (10) employing a 144 VDC battery pack (32) and a three-phase induction motor (18).

  9. Moving beyond the EE and ESD Disciplinary Debate in Formal Education

    ERIC Educational Resources Information Center

    McKeown, Rosalyn; Hopkins, Charles

    2007-01-01

    Many educators think of Education for Sustainable Development (ESD) on a disciplinary level--what is Environmental Education's (EE) contribution to a more sustainable future? Briefly, we describe differences and similarities between EE and ESD. Next, we examine four levels of activity--disciplinary, whole school, educational system, and…

  10. A Distance Detector with a Strip Magnetic MOSFET and Readout Circuit.

    PubMed

    Sung, Guo-Ming; Lin, Wen-Sheng; Wang, Hsing-Kuang

    2017-01-10

    This paper presents a distance detector composed of two separated metal-oxide semiconductor field-effect transistors (MOSFETs), a differential polysilicon cross-shaped Hall plate (CSHP), and a readout circuit. The distance detector was fabricated using 0.18 μm 1P6M Complementary Metal-Oxide Semiconductor (CMOS) technology to sense the magnetic induction perpendicular to the chip surface. The differential polysilicon CSHP enabled the magnetic device to not only increase the magnetosensitivity but also eliminate the offset voltage generated because of device mismatch and Lorentz force. Two MOSFETs generated two drain currents with a quadratic function of the differential Hall voltages at CSHP. A readout circuit-composed of a current-to-voltage converter, a low-pass filter, and a difference amplifier-was designed to amplify the current difference between two drains of MOSFETs. Measurements revealed that the electrostatic discharge (ESD) could be eliminated from the distance sensor by grounding it to earth; however, the sensor could be desensitized by ESD in the absence of grounding. The magnetic influence can be ignored if the magnetic body (human) stays far from the magnetic sensor, and the measuring system is grounded to earth by using the ESD wrist strap (Strap E-GND). Both 'no grounding' and 'grounding to power supply' conditions were unsuitable for measuring the induced Hall voltage.

  11. Delving into Key Dimensions of ESD through Analyses of a Middle School Science Textbook

    ERIC Educational Resources Information Center

    Sahin, Elvan

    2016-01-01

    Uncertainties and debates regarding the term of sustainable development are still going on, and similarly, the notion of education for sustainable development (ESD) is open to debate. There has been an attempt to make the concept of ESD evident, which is quite challenging. Palmer (1998) stated the appropriateness of ESD within environmental…

  12. Shaping the GAP: Ideas for the UNESCO Post-2014 ESD Agenda

    ERIC Educational Resources Information Center

    Taylor, Jim

    2014-01-01

    This paper explores how ESD activities may be viewed on a continuum from "causal" approaches, seeking to cause change in others, to "enabling" orientations where efforts are made to enable people to implement the principles of ESD and respond to the environmental challenges they face from their own context. An enabling…

  13. Building ESD in Latin America

    ERIC Educational Resources Information Center

    Journal of Education for Sustainable Development, 2007

    2007-01-01

    To encourage efforts for furthering the UN DESD agenda in Latin America, a meeting titled "Building Education for Sustainable Development" was held in Costa Rica from 31 October to 2 November 2006. Plenary sessions were interspersed with working groups to look at how ESD can be integrated in formal and non-formal education systems, and…

  14. Fast-responding short circuit protection system with self-reset for use in circuit supplied by DC power

    NASA Technical Reports Server (NTRS)

    Burns, Bradley M. (Inventor); Blalock, Norman N. (Inventor)

    2011-01-01

    A short circuit protection system includes an inductor, a switch, a voltage sensing circuit, and a controller. The switch and inductor are electrically coupled to be in series with one another. A voltage sensing circuit is coupled across the switch and the inductor. A controller, coupled to the voltage sensing circuit and the switch, opens the switch when a voltage at the output terminal of the inductor transitions from above a threshold voltage to below the threshold voltage. The controller closes the switch when the voltage at the output terminal of the inductor transitions from below the threshold voltage to above the threshold voltage.

  15. Layout optimization of GGISCR structure for on-chip system level ESD protection applications

    NASA Astrophysics Data System (ADS)

    Zeng, Jie; Dong, Shurong; Wong, Hei; Hu, Tao; Li, Xiang

    2016-12-01

    To improve the holding voltage, area efficiency and robustness, a comparative study on single finger, 4-finger and round shape layout of gate-grounded-nMOS incorporated SCR (GGISCR) devices are conducted. The devices were fabricated with a commercial 0.35 μm HV-CMOS process without any additional mask or process modification. To have a fair comparison, we develop a new Figure-of-Merit (FOM) modeling for the performance evaluation of these devices. We found that the ring type device which has an It2 value of 18.9 A is area efficient and has smaller effective capacitance. The different characteristics were explained with the different effective ESD currents in these layout structures.

  16. 46 CFR 28.365 - Overcurrent protection and switched circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    .... (c) Each ungrounded current carrying conductor must be protected in accordance with its current carrying capacity by a circuit breaker or fuse at the connection to the switchboard or distribution panel...

  17. 24 CFR 3280.804 - Disconnecting means and branch-circuit protective equipment.

    Code of Federal Regulations, 2010 CFR

    2010-04-01

    ... 24 Housing and Urban Development 5 2010-04-01 2010-04-01 false Disconnecting means and branch... SAFETY STANDARDS Electrical Systems § 3280.804 Disconnecting means and branch-circuit protective equipment. (a) The branch-circuit equipment is permitted to be combined with the disconnecting means as a...

  18. 30 CFR 75.601-2 - Short circuit protection; use of fuses; approval by the Secretary.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Trailing Cables § 75.601-2 Short circuit protection; use of fuses; approval by the Secretary. Fuses shall not be employed to provide short circuit protection for trailing cables unless specifically approved...

  19. 30 CFR 75.601-3 - Short circuit protection; dual element fuses; current ratings; maximum values.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Trailing Cables § 75.601-3 Short circuit protection; dual element fuses; current ratings; maximum values... circuit protection of trailing cables as provided in § 75.601, however, the current ratings of such...

  20. High Current ESD Test of Advanced Triple Junction Solar Array Coupon

    NASA Technical Reports Server (NTRS)

    Wright, Kenneth H., Jr.; Schneider, Todd A.; Vaughn, Jason A.; Hoang, Bao; Wong, Frankie

    2014-01-01

    Testing was conducted on an Advanced Triple Junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by Space Systems/Loral, LLC (SSL). The ATJ coupon was a small, 4-cell, two-string configuration that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The coupon has many attributes of the flight design; e.g., substrate structure with graphite face sheets, integrated by-pass diodes, cell interconnects, RTV grout, wire routing, etc. The objective of the present test was to evaluate the performance of the coupon after being subjected to induced electrostatic discharge (ESD) testing at two string voltages (100 V, 150 V) and four array currents (1.65 A, 2.0 A, 2.475 A, and 3.3 A). An ESD test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc flashover circuitry. A total of 73 primary arcs were obtained that included 7 temporary sustained arcs (TSA) events. The durations of the TSAs ranged from 50 micro-seconds to 2.75 milli-seconds. All TSAs occurred at a string voltage of 150 V. Post-test Large Area Pulsed Solar Simulator (LAPSS), Dark I-V, and By-Pass Diode tests showed that no degradation occurred due to the TSA events. In addition, the post-test insulation resistance measured was > 50 G-ohms between cells and substrate. These test results indicate a robust design for application to a high-current, high-power mission.

  1. Military Handbook: Electrostatic Discharge Control Handbook for Protection of Electrical and Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive Devices (Metric)

    DTIC Science & Technology

    1994-07-31

    everything that is received in ESD protective packaging materials treated as ESDS? YES/NO 40.1.13 Is the use of personal hygiene products , food, drinks...Does the training explain why food, drinks, smoking, personal hygiene products or common plastics are not to be used in ESD protective work areas? YES...trays? YES/NO 40.5.13 Are drinking, eating, smoking, the use of personal hygiene products and common plastics prohibited in the ESD protected work area

  2. Tracing Sustainability: An International Comparison of ESD Implementation into Lower Secondary Education

    ERIC Educational Resources Information Center

    Bagoly-Simó, Péter

    2013-01-01

    With the progress of the DESD, increasing numbers of researchers have been developing indicators to effectively measure the implementation of ESD in formal, informal and non-formal education. This paper aims to measure the implementation of ESD in secondary school curricula in three countries carrying the fingerprints of a developed (Germany),…

  3. Fabricated autologous epidermal cell sheets for the prevention of esophageal stricture after circumferential ESD in a porcine model.

    PubMed

    Kanai, Nobuo; Yamato, Masayuki; Ohki, Takeshi; Yamamoto, Masakazu; Okano, Teruo

    2012-10-01

    Endoscopic submucosal dissection (ESD) is an accepted treatment for early esophageal carcinoma. However, resection of a large mucosal area, as with circumferential ESD, induces severe stricture formation. To evaluate the efficacy of cultured autologous epidermal cell sheets to prevent severe esophageal constriction after circumferential ESD. Animal study. University institute. Eight pigs underwent circumferential esophageal ESD while under general anesthesia. In 4 pigs, fabricated autologous epidermal cell sheets were endoscopically transplanted to the central ESD sites immediately after the ESD. The other 4 pigs underwent circumferential ESD only. Necropsy and histological assessment were performed at 1 and 2 weeks post-ESD. Weight gain, degree of mucosal constriction, and histological assessments. All pigs in the control group showed severe esophageal constriction after 2 weeks. The control and transplanted groups had weight gains of -10.3% and 0.3% (P = .03), respectively, and the mean degrees of constriction were 88% and 56% (P < .01), respectively. Early re-epithelialization and mild fibrosis in the muscularis were observed in the transplanted group. Animal study, small sample size. Fabricated autologous skin epidermal cell sheets would be useful in preventing severe esophageal constriction after circumferential ESD. Copyright © 2012 American Society for Gastrointestinal Endoscopy. Published by Mosby, Inc. All rights reserved.

  4. Life test of a nickel cadmium battery with a protection/reconditioning circuit

    NASA Technical Reports Server (NTRS)

    Lanier, J. R., Jr.; Bush, J. R., Jr.

    1981-01-01

    Results are discussed for a Ni-Cd battery test over a period of 8 years, 2 months and 44,213 simulated low Earth orbits. The battery cells were protected against overdischarge and reversal at discharge rates up to 25 amperes (1.25C) by a battery protection and reconditioning circuit. The circuit performed flawlessly during the test, and proved its value, both as a battery reconditioner and a cell protection device. Battery cell failures are also discussed. The test demonstrated the viability of using Ni-Cd batteries at depth-of-discharge up to 25 percent for over 5 years in a low Earth orbit.

  5. An ESD Pathway to Quality Education in the Cyprus Primary Education Context

    ERIC Educational Resources Information Center

    Kadji-Beltran, Chrysanthi; Christodoulou, Nicoletta; Zachariou, Aravella; Lindemann-Matthies, Petra; Barker, Susan; Kadis, Costas

    2017-01-01

    This research is based on the rationale that the well-defined framework of education for sustainable development (ESD), its connection with real life and its specific integration in the educational policies and curricula can help to enhance quality education (QE) in a meaningful and identifiable way. In a first step, the common ground of ESD and…

  6. Risk factors for post-colorectal endoscopic submucosal dissection (ESD) coagulation syndrome: a multicenter, prospective, observational study

    PubMed Central

    Arimoto, Jun; Higurashi, Takuma; Kato, Shingo; Fuyuki, Akiko; Ohkubo, Hidenori; Nonaka, Takashi; Yamaguchi, Yoshikazu; Ashikari, Keiichi; Chiba, Hideyuki; Goto, Shungo; Taguri, Masataka; Sakaguchi, Takashi; Atsukawa, Kazuhiro; Nakajima, Atsushi

    2018-01-01

    Background and study aims  Colorectal cancer (CRC) is one of the most common neoplasms and endoscopic submucosal dissection (ESD) is an effective treatment for early-stage CRC. However, it has been observed that patients undergoing ESD often complain of pain, even if ESD has been successfully performed. Risk factors for such pain still remain unknown. The aim of this study was to explore the risk factors for post-colorectal ESD coagulation syndrome (PECS). Patients and methods  This was a prospective multicenter observational trial (UMIN000016781) conducted in 106 of 223 patients who underwent ESD between March 2015 and April 2016. We investigated age, sex, tumor location, ESD operation time, lesion size, duration of hospitalization, and frequency of PECS. We defined PECS as local abdominal pain (evaluated on a visual analogue scale) in the region corresponding to the site of the ESD that occurred within 4 days of the procedure. Results  PECS occurred in 15/106 (14.2 %), and 10 were women ( P  = 0.01, OR: 7.74 [1.6 – 36.4]), 7 had lesions in the cecum ( P  < 0.001, OR: 20.6 [3.7 – 115.2]), and 9 in whom ESD operation time was > 90 min ( P  = 0.002, OR: 10.3 [2.4 – 44.6]). Frequency of deviation from the prescribed clinical path was significantly higher (47 % [7/15] vs. 2 % [2/91], P  < 0.001, OR: 38.9 [6.9 – 219.6]), and hospital stay was significantly longer in the PECS group.  Conclusions  Female gender, location of lesion in the cecum, and ESD operation time > 90 minutes were significant risk factors independent of PECS. These findings are important to management of PECS.  PMID:29527556

  7. Earth Charter, ESD and Chinese Philosophies

    ERIC Educational Resources Information Center

    Liu, Yunhua; Constable, Alicia

    2010-01-01

    This article examines the relationship between the Earth Charter and education for sustainable development (ESD), as part of the UN Decade of Education for Sustainable Development. The areas of shared interest between the two are assessed and the invaluable nature of the Earth Charter as a resource outlining global values and principles for a…

  8. Education for Sustainable Development (ESD): The Turn away from "Environment" in Environmental Education?

    ERIC Educational Resources Information Center

    Kopnina, Helen

    2012-01-01

    This article explores the implications of the shift of environmental education (EE) towards education for sustainable development (ESD) in the context of environmental ethics. While plural perspectives on ESD are encouraged both by practitioners and researchers of EE, there is also a danger that such pluralism may sustain dominant political…

  9. Current State and Future Prospects of Education for Sustainable Development (ESD) in Japan

    ERIC Educational Resources Information Center

    Tanaka, Haruhiko

    2017-01-01

    The UN Decade of Education for Sustainable Development (ESD) ran from 2005 to 2014. This study concerns the concepts of Sustainable Development (SD) and ESD. The term "sustainable development" was coined by the Brundtland Commission in 1987 as the key word in integrating environment and development. SD achieved international consensus at…

  10. Engaging Mindfully with the Commons: A Case of Caribbean Teachers' Experience with ESD

    ERIC Educational Resources Information Center

    Down, Lorna

    2015-01-01

    A study of teachers' responses to Education for Sustainable Development (ESD) in a graduate course in Literature and Education for Sustainable Development, at the School of Education, The University of the West Indies, Mona, revealed that ESD can change indifference to the "commons" to one of mindfulness about local and global…

  11. Age Induced Effects on ESD Characteristics of Solar Array Coupons After Combined Space Environmental Exposures

    NASA Technical Reports Server (NTRS)

    Wright, Kenneth H.; Schneider, Todd A.; Vaughn, Jason A.; Hoang, Bao; Funderburk, Victor V.; Wong, Frankie; Gardiner, George

    2012-01-01

    A set of multi-junction GaAs/Ge solar array test coupons provided by Space Systems/Loral were subjected to a sequence of 5-year increments of combined space environment exposure tests. The test coupons capture an integrated design intended for use in a geosynchronous (GEO) space environment. A key component of this test campaign is performing electrostatic discharge (ESD) tests in the inverted gradient mode. The protocol of the ESD tests is based on the ISO standard for ESD testing on solar array panels [ISO-11221]. The test schematic in the ISO reference has been modified with Space System/Loral designed circuitry to better simulate the on-orbit operational conditions of its solar array design. Part of the modified circuitry is to simulate a solar array panel coverglass flashover discharge. All solar array coupons used in the test campaign consist of four cells constructed to form two strings. The ESD tests were performed at the beginning-of-life (BOL) and at each 5-year environment exposure point until end-of-life (EOL) at 15 years. The space environmental exposure sequence consisted of ultra-violet radiation, electron/proton particle radiation, thermal cycling, and Xenon ion thruster plume erosion. This paper describes the ESD test setup and the importance of the electrical test design in simulating the on-orbit operational conditions. Arc inception voltage results along with ESD test behavior from the BOL condition through the 15th year age condition are discussed. In addition, results from a Xenon plasma plume exposure test with an EOL coupon under the full ESD test condition will be discussed.

  12. Single event upset protection circuit and method

    DOEpatents

    Wallner, John; Gorder, Michael

    2016-03-22

    An SEU protection circuit comprises first and second storage means for receiving primary and redundant versions, respectively, of an n-bit wide data value that is to be corrected in case of an SEU occurrence; the correction circuit requires that the data value be a 1-hot encoded value. A parity engine performs a parity operation on the n bits of the primary data value. A multiplexer receives the primary and redundant data values and the parity engine output at respective inputs, and is arranged to pass the primary data value to an output when the parity engine output indicates `odd` parity, and to pass the redundant data value to the output when the parity engine output indicates `even` parity. The primary and redundant data values are suitably state variables, and the parity engine is preferably an n-bit wide XOR or XNOR gate.

  13. Protecting quantum information in superconducting circuits

    NASA Astrophysics Data System (ADS)

    Devoret, Michel

    Can we prolong the coherence of a two-state manifold in a complex quantum system beyond the coherence of its longest-lived component? This question is the starting point in the construction of a scalable quantum computer. It translates in the search for processes that operate as some sort of Maxwell's demon and reliably correct the errors resulting from the coupling between qubits and their environment. The presentation will review recent experiments that test the dynamical protection by Josephson circuits of a logical qubit memory based on superpositions of particular coherent states of a superconducting resonator.

  14. The Co-Evolution of ESD and EE

    ERIC Educational Resources Information Center

    Monroe, Martha C.

    2012-01-01

    William B. Stapp, a major author of the founding documents of environmental education (EE), foreshadowed the triple concerns of education for sustainable development (ESD) with environment, social justice and economic health. Yet EE in the USA tended to follow the advocacy orientation of the environmental movement of the 1970s and later, following…

  15. Examining the Literature to Reveal the Nature of Community EE/ESD Programs and Research

    ERIC Educational Resources Information Center

    Aguilar, Olivia M.

    2018-01-01

    Interest in community environmental education (EE) and community education for sustainable development (ESD) is increasing, as evidenced by the increase in studies examining community EE/ESD approaches and NAAEE's current development of the Community EE Guidelines for Excellence. Thus, the purpose of this paper is to: (1) provide a review of…

  16. ESD Professional Development of University Educators in Serbia, Croatia and Macedonia: A Comparative Analysis

    ERIC Educational Resources Information Center

    Nikolic, Vesna; Milutinovic, Slobodan; Nedanovski, Pece; Mrnjaus, Kornelija

    2017-01-01

    Purpose: The paper aims to deal with the education for sustainable development (ESD) competences of university educators. The purpose of this paper is to provide a comparative analysis of opportunities for the development of ESD competences in higher education (HE) institutions in Serbia, Croatia and Macedonia. In addition, the paper explores the…

  17. Contributions of Education for Sustainable Development (ESD) to Quality Education: A Synthesis of Research

    ERIC Educational Resources Information Center

    Laurie, Robert; Nonoyama-Tarumi, Yuko; Mckeown, Rosalyn; Hopkins, Charles

    2016-01-01

    This research is a synthesis of studies carried out in 18 countries to identify contributions of education for sustainable development (ESD) to quality education. Five common questions were used for the interviews in each country to solicit education leaders and practitioners' views on the outcome and implementation of ESD. The analysis revealed…

  18. Mechanism of Electro-Static Discharge (ESD) Sensitivity of Reactive Powders and Its Mitigation

    DTIC Science & Technology

    2011-03-14

    motivated by both safety requirements for handling flammable gas mixtures and convenience of using spark discharge as a controlled energy igniter for...On the other hand, experimental tests of ESD ignition sensitivity for non-aerosolized powders are among the most commonly used safety assessments...materials, including nanomaterials for a variety of applications. Current protocols used for ESD ignition sensitivity testing, e.g., described in

  19. Developing Partnerships with the Community for Coastal ESD

    ERIC Educational Resources Information Center

    Kawabe, Midori; Kohno, Hiroshi; Ikeda, Reiko; Ishimaru, Takashi; Baba, Osamu; Horimoto, Naho; Kanda, Jota; Matsuyam, Masaji; Moteki, Masato; Oshima, Yayoi; Sasaki, Tsuyoshi; Yap, Minlee

    2013-01-01

    Purpose: The purpose of this paper is to draw lessons for developing community-university partnerships from experiences in promoting coastal education for sustainable development (ESD). Design/methodology/approach: Qualitative data collected from two coastal community outreach projects were analyzed. Findings: The outreach projects improved the…

  20. Technical Reliability Studies. EOS/ESD Technology Abstracts

    DTIC Science & Technology

    1981-01-01

    MECHANISMS MELAMINE MESFETS MICROWAVE MIS 15025 AUTOMATIC MACHINE PRECAUTIONS FOR HOS/OiOS 15006 INSTRUCTIONS FOR INSTALLATION AND...ELIMINATION OF EOS INDUCED SECONDARY FAILURE MECHANISMS 15000 USE OF MELAMINE WORK-SURFACE FOR ESD POTENTIAL BLEED OFF 16141 MICROWAVE NANOSECOND... microwave devices, optoelectronics, and selected nonelectronic parts employed in military, space and commercial applications. In addition, a System

  1. Management Information System for ESD Program Offices.

    DTIC Science & Technology

    1978-03-01

    Management Information System (MIS) functional requirements for the ESD Program Office are defined in terms of the Computer-Aided Design and Specification Tool. The development of the computer data base and a description of the MIS structure is included in the report. This report addresses management areas such as cost/budgeting, scheduling, tracking capabilities, and ECP

  2. Surge Protection in Low-Voltage AC Power Circuits: An Anthology

    NASA Astrophysics Data System (ADS)

    Martzloff, F. D.

    2002-10-01

    The papers included in this part of the Anthology provide basic information on the propagation of surges in low-voltage AC power circuits. The subject was approached by a combination of experiments and theoretical considerations. One important distinction is made between voltage surges and current surges. Historically, voltage surges were the initial concern. After the introduction and widespread use of current-diverting surge-protective devices at the point-of-use, the propagation of current surges became a significant factor. The papers included in this part reflect this dual dichotomy of voltage versus current and impedance mismatch effects versus simple circuit theory.

  3. Protective circuit for thyristor controlled systems and thyristor converter embodying such protective circuit

    DOEpatents

    Downhower, Jr., Francis H.; Finlayson, Paul T.

    1984-04-10

    A snubber circuit coupled across each thyristor to be gated in a chain of thyristors determines the critical output of a NOR LATCH whenever one snubber circuit could not be charged and discharged under normal gating conditions because of a short failure.

  4. Review of Exploration Systems Development (ESD) Integrated Hazard Development Process. Volume 1; Appendices

    NASA Technical Reports Server (NTRS)

    Smiles, Michael D.; Blythe, Michael P.; Bejmuk, Bohdan; Currie, Nancy J.; Doremus, Robert C.; Franzo, Jennifer C.; Gordon, Mark W.; Johnson, Tracy D.; Kowaleski, Mark M.; Laube, Jeffrey R.

    2015-01-01

    The Chief Engineer of the Exploration Systems Development (ESD) Office requested that the NASA Engineering and Safety Center (NESC) perform an independent assessment of the ESD's integrated hazard development process. The focus of the assessment was to review the integrated hazard analysis (IHA) process and identify any gaps/improvements in the process (e.g., missed causes, cause tree completeness, missed hazards). This document contains the outcome of the NESC assessment.

  5. Review of Exploration Systems Development (ESD) Integrated Hazard Development Process. Appendices; Volume 2

    NASA Technical Reports Server (NTRS)

    Smiles, Michael D.; Blythe, Michael P.; Bejmuk, Bohdan; Currie, Nancy J.; Doremus, Robert C.; Franzo, Jennifer C.; Gordon, Mark W.; Johnson, Tracy D.; Kowaleski, Mark M.; Laube, Jeffrey R.

    2015-01-01

    The Chief Engineer of the Exploration Systems Development (ESD) Office requested that the NASA Engineering and Safety Center (NESC) perform an independent assessment of the ESD's integrated hazard development process. The focus of the assessment was to review the integrated hazard analysis (IHA) process and identify any gaps/improvements in the process (e.g. missed causes, cause tree completeness, missed hazards). This document contains the outcome of the NESC assessment.

  6. ESD Implementation at the School Organisation Level, Part 2--Investigating the Transformative Perspective in School Leaders' Quality Strategies at ESD Schools

    ERIC Educational Resources Information Center

    Mogren, Anna; Gericke, Niklas

    2017-01-01

    Previous research has suggested that adopting a transformative school organisation perspective when implementing ESD may be more productive than the previously recommended transmissive perspectives, but it is not clear how transformative perspectives could be introduced. To address this issue, we conducted an empirical mixed methods study of…

  7. 30 CFR 75.601 - Short circuit protection of trailing cables.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... to disconnect power from trailing cables shall be plainly marked and identified and such devices... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Short circuit protection of trailing cables. 75... MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Trailing Cables § 75.601 Short...

  8. 30 CFR 75.601 - Short circuit protection of trailing cables.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... to disconnect power from trailing cables shall be plainly marked and identified and such devices... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Short circuit protection of trailing cables. 75... MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Trailing Cables § 75.601 Short...

  9. 30 CFR 75.601 - Short circuit protection of trailing cables.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... to disconnect power from trailing cables shall be plainly marked and identified and such devices... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Short circuit protection of trailing cables. 75... MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Trailing Cables § 75.601 Short...

  10. 30 CFR 75.601 - Short circuit protection of trailing cables.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... to disconnect power from trailing cables shall be plainly marked and identified and such devices... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Short circuit protection of trailing cables. 75... MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Trailing Cables § 75.601 Short...

  11. Quantitative ESD Guidelines for Charged Spacecraft Derived from the Physics of Discharges

    NASA Technical Reports Server (NTRS)

    Frederickson, A. R.

    1992-01-01

    Quantitative guidelines are proposed for Electrostatic Discharge (ESD) pulse shape on charged spacecraft. The guidelines are based on existing ground test data, and on a physical description of the pulsed discharge process. The guidelines are designed to predict pulse shape for surface charging and internal charging on a wide variety of spacecraft structures. The pulses depend on the area of the sample, its capacitance to ground, and the strength of the electric field in the vacuum adjacent to the charged surface. By knowing the pulse shape, current vs. time, one can determine if nearby circuits are threatened by the pulse. The quantitative guidelines might be used to estimate the level of threat to an existing spacecraft, or to redesign a spacecraft to reduce its pulses to a known safe level. The experiments which provide the data and the physics that allow one to interpret the data will be discussed, culminating in examples of how to predict pulse shape/size. This method has been used, but not confirmed, on several spacecraft.

  12. A study of the initial oxidation of evaporated thin films of aluminum by AES, ELS, and ESD

    NASA Technical Reports Server (NTRS)

    Bujor, M.; Larson, L. A.; Poppa, H.

    1982-01-01

    The room temperature, low pressure, oxidation of evaporated aluminum thin films has been studied by AES, ELS, and ESD. ESD was the most sensitive of the three methods to characterize a clean aluminum surface. Two oxidation stages were distinguished in the 0-3000 L oxygen exposure range. Between 0 and 50 L, the chemisorption of oxygen atoms was characterized by a fast decrease of the 67 eV AES Al peak and the 10 eV surface plasmon peak, and by a simultaneous increase of the oxygen AES and ESD signals. After 50 L, a change in slope in all AES and ESD signal variations was attributed to the slow growth of a thin layer of aluminum oxide, which after 3000 L was still only a few angstroms thick.

  13. 30 CFR 75.800 - High-voltage circuits; circuit breakers.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... shall be equipped with devices to provide protection against under-voltage grounded phase, short circuit... 30 Mineral Resources 1 2010-07-01 2010-07-01 false High-voltage circuits; circuit breakers. 75.800... § 75.800 High-voltage circuits; circuit breakers. [Statutory Provisions] High-voltage circuits entering...

  14. ESD Test Apparatus for Soldering Irons

    NASA Technical Reports Server (NTRS)

    Sancho, Jose; Esser, Robert

    2013-01-01

    ESDA (Electrostatic Discharge Association) ESD STM 13.1-2000 requires frequent testing of the voltage leakage from the tip of a soldering iron and the resistance from the tip of the soldering iron to the common point ground. Without this test apparatus, the process is time-consuming and requires several wires, alligator clips, or test probes, as well as additional equipment. Soldering iron tips must be tested for electrostatic discharge risks frequently, and this typically takes a lot of time in setup and testing. This device enables the operator to execute the full test in one minute or less. This innovation is a simple apparatus that plugs into a digital multimeter (DMM) and the Common Point Ground (CPG) reference. It enables the user to perform two of the electrostatic discharge tests required in ESD STM 13.1-2000. The device consists of a small black box with two prongs sticking out of one end, two inputs on the opposite end (one of the inputs is used to connect the reference CPG to the DMM), and a metal tab on one side. Inside the box are wires, several washers of various materials, and assembly hardware (nuts and screws/bolts). The device is a passive electronic component that is plugged into a DMM. The operator sets the DMM to read voltage. The operator places the heated tip of the soldering iron onto the metal tab with a small amount of solder to ensure a complete connection. The voltage is read and recorded. The operator switches the DMM to read resistance. The operator places the heated tip of the soldering iron onto the metal tab with a small amount of solder to ensure a complete connection. The resistance is recorded. If the recorded voltage and resistance are below a number stated in ESDA ESD STM 13.1-2000, the test is considered to pass. The device includes all the necessary wiring internal to its body so the operator does not need to do any independent wiring, except for grounding. It uses a stack of high-thermal-resistance washers to minimize the

  15. 30 CFR 77.800 - High-voltage circuits; circuit breakers.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... devices to provide protection against under voltage, grounded phase, short circuit and overcurrent. High... 30 Mineral Resources 1 2010-07-01 2010-07-01 false High-voltage circuits; circuit breakers. 77.800... COAL MINES Surface High-Voltage Distribution § 77.800 High-voltage circuits; circuit breakers. High...

  16. Development of internal/external short circuit protection for lithium D cells

    NASA Technical Reports Server (NTRS)

    Mcdonald, Robert C.; Bragg, Bobby J.

    1992-01-01

    A brief discussion of short circuit protection for lithium D cells is given in viewgraph format. The following topics are presented: (1) historical need; (2) program objectives; (3) composite thermal switch (CTS) development; (4) laboratory cells with CTS; and (5) the incorporation of CTS into lithium D cells.

  17. Push-pull converter with energy saving circuit for protecting switching transistors from peak power stress

    NASA Technical Reports Server (NTRS)

    Mclyman, W. T. (Inventor)

    1981-01-01

    In a push-pull converter, switching transistors are protected from peak power stresses by a separate snubber circuit in parallel with each comprising a capacitor and an inductor in series, and a diode in parallel with the inductor. The diode is connected to conduct current of the same polarity as the base-emitter juction of the transistor so that energy stored in the capacitor while the transistor is switched off, to protect it against peak power stress, discharges through the inductor when the transistor is turned on, and after the capacitor is discharges through the diode. To return this energy to the power supply, or to utilize this energy in some external circuit, the inductor may be replaced by a transformer having its secondary winding connected to the power supply or to the external circuit.

  18. The new technological solution for the JT-60SA quench protection circuits

    NASA Astrophysics Data System (ADS)

    Gaio, E.; Maistrello, A.; Novello, L.; Matsukawa, M.; Perna, M.; Ferro, A.; Yamauchi, K.; Piovan, R.

    2018-07-01

    An advanced technology has been developed and employed for the main circuit breakers (CB) of the quench protection circuits (QPC) of the superconducting coils of JT-60SA: it consists in a Hybrid mechanical-static CB (HCB) composed of a mechanical Bypass switch (BPS) for conducting the continuous current, in parallel to a static circuit breaker (SCB) based on integrated gate commutated thyristor (IGCT) for current interruption. It was the result of a R&D program carried out since 2006 to identify innovative solutions for the interruption of high dc current, able to improve the maintainability and availability of the CB. The HCB developed for the JT-60SA QPC is the first realization of a dc circuit breaker based on this design approach for interrupting current of some tens of kA with reapplied voltage of some kV. It also represents the first application of hybrid technology with IGCT for protection of superconducting magnets in fusion experiments. The paper aims at giving a comprehensive overview of the main R&D activities devoted to the development of this new technological approach; then, the key aspects of the design, manufacturing and testing of the QPCs for JT-60SA, successfully completed in Naka Site in summer 2015 are presented. Finally, the significance of this research is discussed and the possible future developments, in particular in view of DEMO fusion reactor, are outlined.

  19. ESD and lifelong learning: a case study of the Shangri-la Institute's current engagement with the Bazhu community in Diqing, China

    NASA Astrophysics Data System (ADS)

    Liu, Yunhua; Constable, Alicia

    2010-06-01

    This article argues that ESD should be integrated into lifelong learning and provides an example of how this might be done. It draws on a case study of a joint project between the Shangri-la Institute and the Bazhu community in Diqing, southwest China, to analyse a community-based approach to Education for Sustainable Development and assess its implications for lifelong learning. The article examines the different knowledge, skills and values needed for ESD across the life span and asserts the need for these competencies to be informed by the local context. The importance of linking ESD with local culture and indigenous knowledge is emphasised. The article goes on to propose methods for integrating ESD into lifelong learning and underscore the need for learning at the individual, institutional and societal levels in formal, non-formal and informal learning settings. It calls for institutional changes that link formal, non-formal and informal learning through the common theme of ESD, and establish platforms to share experiences, reflect on these and thereby continually improve ESD.

  20. A Critical Review of Education for Sustainable Development (ESD) in Japan: Beyond the Practice of Pouring New Wine into Old Bottles

    ERIC Educational Resources Information Center

    Nagata, Yoshiyuki

    2017-01-01

    Japan stands as a rare country in which ESD has been incorporated as mainstream policy. However, looking back on the United Nations Decade of Education for Sustainable Development (UNDESD), ESD has not brought about the transformation in Japan that one expects ESD to aim for, despite this support at the policy level. The cause may be that pouring…

  1. Effects of Contextual Factors on ESD in Teacher Education

    ERIC Educational Resources Information Center

    Atmaca, Çagla

    2017-01-01

    Education for sustainable development (ESD) guides and empowers educators to reshape their thinking style and move towards a sustainable future. It has attracted a lot of attention and been studied in different perspectives. However, contextual factors have not been studied in relation to sustainable development for teacher education. Therefore,…

  2. Low Insertion HVDC Circuit Breaker: Magnetically Pulsed Hybrid Breaker for HVDC Power Distribution Protection

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    None

    2012-01-09

    GENI Project: General Atomics is developing a direct current (DC) circuit breaker that could protect the grid from faults 100 times faster than its alternating current (AC) counterparts. Circuit breakers are critical elements in any electrical system. At the grid level, their main function is to isolate parts of the grid where a fault has occurred—such as a downed power line or a transformer explosion—from the rest of the system. DC circuit breakers must interrupt the system during a fault much faster than AC circuit breakers to prevent possible damage to cables, converters and other grid-level components. General Atomics’ high-voltagemore » DC circuit breaker would react in less than 1/1,000th of a second to interrupt current during a fault, preventing potential hazards to people and equipment.« less

  3. Reviewing Strategies in/for ESD Policy Engagement: Agency Reclaimed

    ERIC Educational Resources Information Center

    Lotz-Sisitka, Heila

    2016-01-01

    In this response article, I draw on critical realist perspectives to engage with the argument put forward in Bengtsson's study, which sees agency as an ontological necessity for Education for Sustainable Development (ESD) policy engagement. Bengtsson supports a notion of the logic of contingent action over the logic of power as dominance,…

  4. Role of observation of live cases done by Japanese experts in the acquisition of ESD skills by a western endoscopist.

    PubMed

    Draganov, Peter V; Chang, Myron; Coman, Roxana M; Wagh, Mihir S; An, Qi; Gotoda, Takuji

    2014-04-28

    To evaluate the role of observation of experts performing endoscopic submucosal dissection (ESD) in the acquisition of ESD skills. This prospective study is documenting the learning curve of one Western endoscopist. The study consisted of three periods. In the first period (pre-observation), the trainee performed ESDs in animal models in his home institution in the United States. The second period (observation) consisted of visit to Japan and observation of live ESD cases done by experts. The observation of cases occurred over a 5-wk period. During the third period (post-observation), the trainee performed ESD in animal models in a similar fashion as in the first period. Three animal models were used: live 40-50 kg Yorkshire pig, explanted pig stomach model, and explanted pig rectum model. The outcomes from the ESDs done in the animal models before and after observation of live human cases (main study intervention) were compared. Statistical analysis of the data included: Fisher's exact test to compare distributions of a categorical variable, Wilcoxon rank sum test to compare distributions of a continuous variable between the two groups (pre-observation and post-observation), and Kruskal-Wallis test to evaluate the impact of lesion location and type of model (ex-vivo vs live pig) on lesion removal time. The trainee performed 38 ESDs in animal model (29 pre-observation/9 post-observation). The removal times post-observation were significantly shorter than those pre-observation (32.7 ± 15.0 min vs 63.5 ± 9.8 min, P < 0.001). To minimize the impact of improving physician skill, the 9 lesions post-observation were compared to the last 9 lesions pre-observation and the removal times remained significantly shorter (32.7 ± 15.0 min vs 61.0 ± 7.4 min, P = 0.0011). Regression analysis showed that ESD observation significantly reduced removal time when controlling for the sequence of lesion removal (P = 0.025). Furthermore, it was also noted a trend towards decrease in

  5. Practicing ESD at School: Integration of Formal and Nonformal Education Methods Based on the Earth Charter (Belarusian Experience)

    ERIC Educational Resources Information Center

    Savelava, Sofia; Savelau, Dmitry; Cary, Marina Bakhnova

    2010-01-01

    The Earth Charter represents the philosophy and ethics necessary to create a new period of human civilization. Understanding and adoption of this new vision is the most important mission of education for sustainable development (ESD). This article argues that for successful implementation of ESD principles at school, the school education system…

  6. High efficiency and enhanced ESD properties of UV LEDs by inserting p-GaN/p-AlGaN superlattice

    NASA Astrophysics Data System (ADS)

    Huang, Yong; Li, PeiXian; Yang, Zhuo; Hao, Yue; Wang, XiaoBo

    2014-05-01

    Significantly improved electrostatic discharge (ESD) properties of InGaN/GaN-based UV light-emitting diode (LED) with inserting p-GaN/p-AlGaN superlattice (p-SLs) layers (instead of p-AlGaN single layer) between multiple quantum wells and Mg-doped GaN layer are reported. The pass yield of the LEDs increased from 73.53% to 93.81% under negative 2000 V ESD pulses. In addition, the light output power (LOP) and efficiency droop at high injection current were also improved. The mechanism of the enhanced ESD properties was then investigated. After excluding the effect of capacitance modulation, high-resolution X-ray diffraction (XRD) and atomic force microscope (AFM) measurements demonstrated that the dominant mechanism of the enhanced ESD properties is the material quality improved by p-SLs, which indicated less leakage paths, rather than the current spreading improved by p-SLs.

  7. The Development of ESD-Related Competencies in Supportive Institutional Frameworks

    ERIC Educational Resources Information Center

    de Haan, Gerhard

    2010-01-01

    Although Education for Sustainable Development (ESD) is a matter of global importance, the requirements and needs of people differ according to their regional circumstances. (Not only) in Germany--in keeping with the increasingly international focus of "output" evaluations--one dominant educational debate has centred on effective ways of…

  8. Peace Education, ESD and the Earth Charter: Interconnections and Synergies

    ERIC Educational Resources Information Center

    Toh, Swee-Hin; Cawagas, Virginia Floresca

    2010-01-01

    This article provides a review of how the values and principles of the Earth Charter initiative relate to two specific innovative movements of educational transformation, namely peace education and education for sustainable development (ESD). The interconnections and synergies between these movements and the Earth Charter are highlighted.…

  9. [The Efficiency and Complications of ESD and ESTD in the Treatment of Large Esophageal Mucosal Lesions].

    PubMed

    Wang, Jin; Qin, Jin-yu; Guo, Tian-jiao; Gan, Tao; Wang, Yi-ping; Wu, Jun-chao

    2015-11-01

    To study the efficiency and complications of endoscopic submucosal dissection (ESD) and endoscopic submucosal tunnel dissection (ESTD) in the treatment of large esophageal mucosal lesions. The clinical data were collected from the patients who received ESD or ESTD for the treatment of early esophageal lesions in our hospital during January 1, 2014 to July 15, 2015, including the en bloc resection rate, curative resection rate, postoperative complication rate, the risk factors of complications were explored by univariate and multivariate analysis. A total of 50 patients were involved in the study, ESD or ESTD were performed successfully in 53 times, including 6 cases of ESD,47 cases of ESTD, The average age was (61.9 +/- 6.8) yr., the average operating time was (83.57 +/- 32.33) min, the average dissected lesion was (14.82 +/- 3.18) cm2, En bloc resection rate was 94.34%, the curative rate was 84.90%. There were 1 case of bleeding, 1 case of perforation, 45 (84.90%) cases of fever, 13 cases (24.53%) of esophageal stricture. The severity of stricture was associated with the operation time Codds ratio (OR) = 1.040, 95% confidence interal (CI): 1.007-1.075) and esophageal circumference (OR=9.972, 95% CI: 1.221-81.416). The residual resection margin appeared in 8 patients, and the lesion area (OR=1.145, 95% CI: 1.013-1.294) was the only risk factor. ESD and ESTD are safe and effective in the treatment of early esophageal lesions, but seems have relatively high incidence of esopgageal stricture and residual resection margin in the treatment of large esophageal lesions.

  10. DEVELOPMENT OF ELECTRO-ACOUSTIC SOIL DECONTAMINATION (ESD) FOR IN-SITU APPLICATIONS

    EPA Science Inventory

    The technical feasibility of electro-acoustic soil decontamination process through lab experiments demonstrated the removal/-concentration of heavy metals such as cadmium and zinc. Results of the decane contaminated soils were, however, inconclusive. The ESD process is based on t...

  11. 46 CFR 169.684 - Overcurrent protection for motors and motor branch circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 46 Shipping 7 2011-10-01 2011-10-01 false Overcurrent protection for motors and motor branch... motors and motor branch circuits. (a) Except as provided in paragraph (d) of this section, each motor... motor that is responsive to motor current or to both motor current and temperature may be used. (b) The...

  12. From environment to sustainable development: China's strategies for ESD in basic education

    NASA Astrophysics Data System (ADS)

    Zhang, Tiedao

    2010-06-01

    This paper intends to provide an overview of the reorientation of education in China in the period 1998-2009 with regard to development issues. During this time, the focus has shifted gradually from the environment and health to education for sustainable development. The article centres on highlighting the main interventions and strategies adopted by China's schools to make this reorientation possible, including: the introduction of new visions of sustainable development and project planning; the establishment of organisational mechanisms and capacity-building measures for their implementation in the field; the integration of ESD into teaching and learning processes; the maintenance of an action-research mechanism for innovations; and the sharing of lessons with both the national and the international community in order to make the implementation of ESD more effective.

  13. 30 CFR 75.518-2 - Incandescent lamps, overload and short circuit protection.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Incandescent lamps, overload and short circuit protection. 75.518-2 Section 75.518-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518-2 Incandescent...

  14. 30 CFR 75.518-2 - Incandescent lamps, overload and short circuit protection.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... 30 Mineral Resources 1 2011-07-01 2011-07-01 false Incandescent lamps, overload and short circuit protection. 75.518-2 Section 75.518-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518-2 Incandescent...

  15. 30 CFR 75.518-2 - Incandescent lamps, overload and short circuit protection.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Incandescent lamps, overload and short circuit protection. 75.518-2 Section 75.518-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518-2 Incandescent...

  16. 30 CFR 75.518-2 - Incandescent lamps, overload and short circuit protection.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Incandescent lamps, overload and short circuit protection. 75.518-2 Section 75.518-2 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES Electrical Equipment-General § 75.518-2 Incandescent...

  17. Lightning and surge protection, grounding, bonding and shielding requirements for facilities and electronic equipment

    DOT National Transportation Integrated Search

    2002-08-09

    This document mandates standard lightning protection, transient protection, electrostatic discharge (ESD), grounding, bonding and shielding configurations and procedures for new facilities, facility modifications, facility up grades, new equipment in...

  18. A Novel Telemanipulated Robotic Assistant for Surgical Endoscopy: Preclinical Application to ESD.

    PubMed

    Zorn, Lucile; Nageotte, Florent; Zanne, Philippe; Legner, Andras; Dallemagne, Bernard; Marescaux, Jacques; de Mathelin, Michel

    2018-04-01

    Minimally invasive surgical interventions in the gastrointestinal tract, such as endoscopic submucosal dissection (ESD), are very difficult for surgeons when performed with standard flexible endoscopes. Robotic flexible systems have been identified as a solution to improve manipulation. However, only a few such systems have been brought to preclinical trials as of now. As a result, novel robotic tools are required. We developed a telemanipulated robotic device, called STRAS, which aims to assist surgeons during intraluminal surgical endoscopy. This is a modular system, based on a flexible endoscope and flexible instruments, which provides 10 degrees of freedom (DoFs). The modularity allows the user to easily set up the robot and to navigate toward the operating area. The robot can then be teleoperated using master interfaces specifically designed to intuitively control all available DoFs. STRAS capabilities have been tested in laboratory conditions and during preclinical experiments. We report 12 colorectal ESDs performed in pigs, in which large lesions were successfully removed. Dissection speeds are compared with those obtained in similar conditions with the manual Anubiscope platform from Karl Storz. We show significant improvements ( ). These experiments show that STRAS (v2) provides sufficient DoFs, workspace, and force to perform ESD, that it allows a single surgeon to perform all the surgical tasks and those performances are improved with respect to manual systems. The concepts developed for STRAS are validated and could bring new tools for surgeons to improve comfort, ease, and performances for intraluminal surgical endoscopy.

  19. Contribution of Kobe University to the Regional Centre of Expertise (RCE) on Education for Sustainable Development (ESD) Hyogo-Kobe

    ERIC Educational Resources Information Center

    Itoh, Masayuki; Suemoto, Makoto; Matsuoka, Koji; Ito, Atsushi; Yui, Kiyomitsu; Matsuda, Tsuyoshi; Ishikawa, Masanobu

    2008-01-01

    Purpose: The purpose of this paper is to introduce the Regional Centre of Expertise (RCE) on education for sustainable development (ESD) Hyogo-Kobe, and the contribution of Kobe University as a model case. An attempt to develop and implement a new ESD programme in higher education is also reported. Design/methodology/approach: A brief description…

  20. On-Die Sensors for Transient Events

    NASA Astrophysics Data System (ADS)

    Suchak, Mihir Vimal

    Failures caused by transient electromagnetic events like Electrostatic Discharge (ESD) are a major concern for embedded systems. The component often failing is an integrated circuit (IC). Determining which IC is affected in a multi-device system is a challenging task. Debugging errors often requires sophisticated lab setups which require intentionally disturbing and probing various parts of the system which might not be easily accessible. Opening the system and adding probes may change its response to the transient event, which further compounds the problem. On-die transient event sensors were developed that require relatively little area on die, making them inexpensive, they consume negligible static current, and do not interfere with normal operation of the IC. These circuits can be used to determine the pin involved and the level of the event in the event of a transient event affecting the IC, thus allowing the user to debug system-level transient events without modifying the system. The circuit and detection scheme design has been completed and verified in simulations with Cadence Virtuoso environment. Simulations accounted for the impact of the ESD protection circuits, parasitics from the I/O pin, package and I/O ring, and included a model of an ESD gun to test the circuit's response to an ESD pulse as specified in IEC 61000-4-2. Multiple detection schemes are proposed. The final detection scheme consists of an event detector and a level sensor. The event detector latches on the presence of an event at a pad, to determine on which pin an event occurred. The level sensor generates current proportional to the level of the event. This current is converted to a voltage and digitized at the A/D converter to be read by the microprocessor. Detection scheme shows good performance in simulations when checked against process variations and different kind of events.

  1. Endoscopic Submucosal Dissection (ESD) with Additional Therapy for Superficial Esophageal Cancer with Submucosal Invasion.

    PubMed

    Ikeda, Atsuki; Hoshi, Namiko; Yoshizaki, Tetsuya; Fujishima, Yoshimi; Ishida, Tsukasa; Morita, Yoshinori; Ejima, Yasuo; Toyonaga, Takashi; Kakechi, Yoshihiro; Yokosaki, Hiroshi; Azuma, Takeshi

    2015-01-01

    The standard treatment for submucosal esophageal cancer is esophagectomy or chemoradiotherapy (CRT). However, these treatment modalities could deteriorate the general condition and quality of life of the patients who are intolerant to invasive therapy. It is therefore important and beneficial to develop less invasive treatment protocols for these patients. The study included 43 patients who were clinically suspected of mucosa or submucosal esophageal cancer but underwent endoscopic submucosal dissection (ESD) as a primary treatment, due to the patients' poor performance statuses and/or preferences for less invasive therapy. According to the pathological findings and patient's general condition, whether the patient underwent additional treatments or remained hospitalized without additional treatments was thereafter decided for each patient. We retrospectively analyzed the outcomes of these patients. Fifteen patients underwent additional surgery, 11 patients underwent CRT/radiation therapy (RT) and 17 patients were followed without additional treatments. During the 3-year follow-up period, the relapse-free survival rates in the patients who received or did not receive additional treatments were 88% and 64%, respectively (95% confidence interval, 0.45-0.76, p=0.04). The relapse-free and overall survival rates in the patients with additional treatments were equivalent or superior to those described in previous reports of the standard treatments. Preceding ESD contributed to reduce the local relapse significantly to approximately 3.5% and additional CRT-related toxicities. Preceding ESD is very effective for the local control of cancer, and useful for histologically confirming the high-risk factors of relapse, such as ≥submucosal layer 2 (SM2) invasion and lymphovascular involvements. ESD with additional therapy may be a promising strategy for optimizing the selection of therapy depending on the patient's general condition.

  2. Exploring the Current Position of ESD in UK Higher Education Institutions

    ERIC Educational Resources Information Center

    Fiselier, Evelien S.; Longhurst, James W. S.; Gough, Georgina K.

    2018-01-01

    Purpose: The purpose of this paper is to consider the position of education for sustainable development in the UK Higher Education (HE) sector with respect to the Quality Assurance Agency (QAA) and Higher Education Academy (HEA) Guidance for education for sustainable development (ESD). Design/methodology/approach: By means of a mixed-method…

  3. Teaching and Learning for Sustainable Development: ESD Research in Technology Education

    ERIC Educational Resources Information Center

    Pavlova, Margarita

    2013-01-01

    When education for sustainable development (ESD) emerged as part of the educational agenda in the international arena, it was associated with significant shifts in the educational debate about the purpose and nature of education and with the need to respond to crises caused by the modern idea of progress. Scientists from different fields warn…

  4. High pressure jet injection of viscous solutions for endoscopic submucosal dissection (ESD): first clinical experience.

    PubMed

    Pioche, Mathieu; Lépilliez, Vincent; Déprez, Pierre; Giovannini, Marc; Caillol, Fabrice; Piessevaux, Hubert; Rivory, Jérôme; Guillaud, Olivier; Ciocîrlan, Mihai; Salmon, Damien; Lienhart, Isabelle; Lafon, Cyril; Saurin, Jean-Christophe; Ponchon, Thierry

    2015-08-01

    Long lasting elevation is a key factor during endoscopic submucosal dissection (ESD) and can be obtained by water jet injection of saline solution or by viscous macromolecular solutions. In a previous animal study, we assessed the Nestis Enki II system to combine jet injection and viscous solutions. In the present work, we used this combination in humans in different sites of the digestive tract. We retrospectively report all of the consecutive ESD procedures performed with jet injection of viscous solutions in four centers. Information was collected about the lesion, the procedure, the histological result, and the outcomes for the patient. In total, 45 resections were completed by six operators: five experts and one beginner with only one previous experience in human ESD. Lesions were located in the esophagus (10), the stomach (11), the duodenum (1), the colon (1) and the rectum (22). Average maximal lesion diameter was 4.8 cm (SD 2.4, range 2 - 11 cm), average lesion surface area was 19.8 cm(2) (SD 17.7, range 2.2 - 72 cm(2)), and average duration of procedure was 79.9 min (SD 50.3 min, range 19 - 225 min). ESD could be conducted while the endoscope was retroflexed at its maximum in 26 cases. Four adverse events were observed: two diminutive perforations and two delayed bleeding occurrences treated conservatively. The R0 resection rate was 91.1 %. The catheter was obstructed in six occurrences of bleeding. Endoscopic submucosal dissection using high pressure injection of viscous macromolecular solutions is safe and effective in different parts of the digestive tract. It does not impede working with the endoscope in the maximal retroflexed position.

  5. Professional Development of University Educators in ESD: A Study from Pedagogical Styles

    ERIC Educational Resources Information Center

    Callejas Restrepo, Maria Mercedes; Blanco-Portela, Norka; Ladino-Ospina, Yolanda; Tuay Sigua, Rosa Nidia; Vargas, Kenneth Ochoa

    2017-01-01

    Purpose: The aim of this paper is to present a vision for university educator professional development, based on self-analysis of pedagogical styles and production of knowledge about the practices that promote education for sustainable development (ESD). Design/methodology/approach: The "STSE" course is part of the department's…

  6. Practical Pedagogy for Embedding ESD in Science, Technology, Engineering and Mathematics Curricula

    ERIC Educational Resources Information Center

    Hopkinson, Peter; James, Peter

    2010-01-01

    Purpose--The purpose of this paper is to review and highlight some recent examples of embedding education for sustainable development (ESD), within science and related curricula in ways that are meaningful and relevant to staff and students and reflect on different embedding strategies and discourses. Design/methodology/approach--A review of…

  7. High Current ESD Test of Advanced Triple Junction Solar Array Coupon

    NASA Technical Reports Server (NTRS)

    Wright, Kenneth H., Jr.; Schneider, Todd A.; Vaughn, Jason A.; Hoang, Bao; Wong, Frankie

    2015-01-01

    A test was conducted on an Advanced Triple Junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by SSL. The ATJ coupon was a small, 4-cell, two-string configuration that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The coupon has many attributes of the flight design; e.g., substrate structure with graphite face sheets, integrated by-pass diodes, cell interconnects, RTV grout, wire routing, etc. The objective of the present test was to evaluate the performance of the coupon after being subjected to induced electrostatic discharge testing at two string voltages (100 V, 150 V) and four array current (1.65 A, 2.0 A, 2.475 A, and 3.3 A). An ESD test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc flashover circuitry. A total of 73 primary arcs were obtained that included 7 temporary sustained arcs (TSA) events. The durations of the TSAs ranged from 50 micros to 2.9 ms. All TSAs occurred at a string voltage of 150 V. Post-test Large Area Pulsed Solar Simulator (LAPSS), Dark I-V, and By-Pass Diode tests showed that no degradation occurred due to the TSA events. In addition, the post-test insulation resistance measured was > 50 G-ohms between cells and substrate. These test results indicate a robust design for application to a high-current, high-power mission application.

  8. High Current ESD Test of Advanced Triple Junction Solar Array Coupon

    NASA Technical Reports Server (NTRS)

    Wright, K. H.; Schneider, T. A.; Vaughn, J. A.; Hoang, B.; Wong, F.

    2014-01-01

    A test was conducted on an Advanced Triple Junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by SSL. The ATJ coupon was a small, 4-cell, two-string configuration that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The coupon has many attributes of the flight design; e.g., substrate structure with graphite face sheets, integrated by-pass diodes, cell interconnects, RTV grout, wire routing, etc. The objective of the present test was to evaluate the performance of the coupon after being subjected to induced electrostatic discharge testing at two string voltages (100 V, 150 V) and four array current (1.65 A, 2.0 A, 2.475 A, and 3.3 A). An ESD test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc flashover circuitry. A total of 73 primary arcs were obtained that included 7 temporary sustained arcs (TSA) events. The durations of the TSAs ranged from 50 µs to 2.9 ms. All TSAs occurred at a string voltage of 150 V. Post-test Large Area Pulsed Solar Simulator (LAPSS), Dark I-V, and By-Pass Diode tests showed that no degradation occurred due to the TSA events. In addition, the post-test insulation resistance measured was > 50 G-ohms between cells and substrate. These test results indicate a robust design for application to a high-current, high-power mission application.

  9. EMR is not inferior to ESD for early Barrett’s and EGJ neoplasia: An extensive review on outcome, recurrence and complication rates

    PubMed Central

    Komeda, Yoriaki; Bruno, Marco; Koch, Arjun

    2014-01-01

    Background and study aims In recent years, it has been reported that early Barrett’s and esophagogastric junction (EGJ) neoplasia can be effectively and safely treated using endoscopic mucosal resection (EMR) and endoscopic submucosal dissection (ESD). Multiband mucosectomy (MBM) appears to be the safest EMR method. The aim of this systematic review is to assess the safety and efficacy of MBM compared with ESD for the treatment of early neoplasia in Barrett’s or at the EGJ. Methods A literature review of studies published up to May 2013 on EMR and ESD for early Barrett’s esophagus (BE) neoplasia and adenocarcinoma at the EGJ was performed through MEDLINE, EMBASE and the Cochrane Library. Results on outcome parameters such as number of curative resections, complications and procedure times are compared and reported. Results A total of 16 studies met the inclusion criteria for analysis in this study. There were no significant differences in recurrence rates when comparing EMR (10/380, 2.6 %) to ESD (1/333, 0.7 %) (OR 8.55; 95 %CI, 0.91 – 80.0, P = 0.06). All recurrences after EMR were treated with additional endoscopic resection. The risks of delayed bleeding, perforation and stricture rates in both groups were similar. The procedure was considerably less time-consuming in the EMR group (mean time 36.7 min, 95 %CI, 34.5 – 38.9) than in the ESD group (mean time 83.3 min, 95 %CI, 57.4 – 109.2). Conclusions The MBM technique for EMR is as effective as ESD when comparing outcomes related to recurrence and complication rates for the treatment of early Barrett’s or EGJ neoplasia. The MBM technique is considerably less time-consuming. PMID:26135261

  10. Common approach to solving SGEMP, DEMP, and ESD survivability

    NASA Technical Reports Server (NTRS)

    Ling, D.

    1977-01-01

    System Generated Electromagnetic Pulse (SGEMP) and Dispersed Electromagnetic Pulse DEMP) are nuclear generated spacecraft environments. Electrostatic discharge (ESD) is a natural spacecraft environment resulting from differential charging in magnetic substorms. All three phenomena, though differing in origin, result in the same problem to the spacecraft and that is Electromagnetic Interference (EMI). A common design approach utilizing a spacecraft structural Faraday Cage is presented which helps solve the EMI problem. Also, other system design techniques are discussed which minimize the magnitude of these environments through control of materials and electrical grounding configuration.

  11. A Collaborative Action Research Project towards Embedding ESD within the Higher Education Curriculum

    ERIC Educational Resources Information Center

    Cebrián, Gisela

    2017-01-01

    Purpose: This paper aims to present a collaborative action research project conducted at the University of Southampton with the aim to promote curriculum and professional development in education for sustainable development (ESD) and learn from everyday practices of academics. Design/methodology/approach: An action research approach guided by…

  12. An Investigative Redesign of the ECG and EMG Signal Conditioning Circuits for Two-fault Tolerance and Circuit Improvement

    NASA Technical Reports Server (NTRS)

    Obrien, Edward M.

    1991-01-01

    An investigation was undertaken to make the elctrocardiography (ECG) and the electromyography (EMG) signal conditioning circuits two-fault tolerant and to update the circuitry. The present signal conditioning circuits provide at least one level of subject protection against electrical shock hazard but at a level of 100 micro-A (for voltages of up to 200 V). However, it is necessary to provide catastrophic fault tolerance protection for the astronauts and to provide protection at a current level of less that 100 micro-A. For this study, protection at the 10 micro-A level was sought. This is the generally accepted value below which no possibility of microshock exists. Only the possibility of macroshock exists in the case of the signal conditioners. However, this extra amount of protection is desirable. The initial part deals with current limiter circuits followed by an investigation into the signal conditioner specifications and circuit design.

  13. Power-Switching Circuit

    NASA Technical Reports Server (NTRS)

    Praver, Gerald A.; Theisinger, Peter C.; Genofsky, John

    1987-01-01

    Functions of circuit breakers, meters, and switches combined. Circuit that includes power field-effect transistors (PFET's) provides on/off switching, soft starting, current monitoring, current tripping, and protection against overcurrent for 30-Vdc power supply at normal load currents up to 2 A. Has no moving parts.

  14. Reducing/Eliminating ESD Hazards During Pyro Operations

    NASA Technical Reports Server (NTRS)

    Soriano, Jose Francisco; Kelley, J. D. (Technical Monitor)

    2001-01-01

    Several safety concerns have occurred during pyro operations at 30% or lower RH in the OPF area based on the increase of electrostatic discharge (ESD). These concerns targeted the safety of personnel, flight hardware, and ground support equipment (GSE). Two proposed methods considered to control ESDs during pyro operations at 30% or lower RH are the use of an ionizer blower and to increase the moisture content. In order to demonstrate that the ionizer is effective in neutralizing static charge, a series of experimental runs were conducted in the Electrostatics Laboratory located in the Operations & Checkout (O&C) Building at NASA Kennedy Space Center (KSC). The effectiveness of the ionizer blower was evaluated based upon the time lapse of a charged metal plate from initial 1000 to 400 volts. Distance, RH, and angle of attack were studied. A full factorial experiment (2(exp 3) = 8) was conducted. Since we did not have a statistical analysis program, such as SAS, available, calculations were done manually based on the method of ANOVA (Analysis of Variances), but R(exp 2) (fitness of curve) was not obtained. As conjectured, distance was found to be the major influencial variable. Therefore, we concluded that the best possible combination of situations would be to position the ionizer blower as close as possible and facing directly into the charged plate. This scenario resulted in the quickest discharge rate, which would be the most beneficial during pyro operations below 30% RH. The second method of increasing the moisture content in the work environment through a modification of the OPF ECS current configuration appeared to be dependent on budget constraints and currently not planned to be modified. Finally, some recommendations are discussed such as to test the ionizer in an actual field experiment with a mockup pyro connector and a technician with all the NASA KSC Safety-compliant PPE to assess the realistic effectiveness of the ionizer blower.

  15. Search and Retrieval Index to EOS/ESD Symposium Proceedings - 1979 to 1984.

    DTIC Science & Technology

    1985-04-15

    This book contains indexes used in searching for information contained in papers produced in Electrical Overstress/Electrostatic Discharge (EOS/ESD) Symposium 1979 to 1984. These indexes are the Alphabetical List of Index Terms, Subject Index, Author Index , Corporate Index, Keywords in Title Index, and Chronological List of Papers Index. These indexes provide a clear, easy-to-read, and concise method of searching for and

  16. VO-ESD: a virtual observatory approach to describe the geomagnetic field temporal variations with application to Swarm data

    NASA Astrophysics Data System (ADS)

    Saturnino, Diana; Langlais, Benoit; Amit, Hagay; Mandea, Mioara; Civet, François; Beucler, Éric

    2017-04-01

    A complete description of the main geomagnetic field temporal variation is crucial to understand dynamics in the core. This variation, termed secular variation (SV), is known with high accuracy at ground magnetic observatory locations. However the description of its spatial variability is hampered by the globally uneven distribution of the observatories. For the past two decades a global coverage of the field changes has been allowed by satellites. Their surveys of the geomagnetic field have been used to derive and improve global spherical harmonic (SH) models through some strict data selection schemes to minimise external field contributions. But discrepancies remain between ground measurements and field predictions by these models. Indeed, the global models do not reproduce small spatial scales of the field temporal variations. To overcome this problem we propose a modified Virtual Observatory (VO) approach by defining a globally homogeneous mesh of VOs at satellite altitude. With this approach we directly extract time series of the field and its temporal variation from satellite measurements as it is done at observatory locations. As satellite measurements are acquired at different altitudes a correction for the altitude is needed. Therefore, we apply an Equivalent Source Dipole (ESD) technique for each VO and each given time interval to reduce all measurements to a unique location, leading to time series similar to those available at ground magnetic observatories. Synthetic data is first used to validate the new VO-ESD approach. Then, we apply our scheme to measurements from the Swarm mission. For the first time, a 2.5 degrees resolution global mesh of VO times series is built. The VO-ESD derived time series are locally compared to ground observations as well as to satellite-based model predictions. The approach is able to describe detailed temporal variations of the field at local scales. The VO-ESD time series are also used to derive global SH models. Without

  17. Antigravity ESD - double-balloon-assisted underwater with traction hybrid technique.

    PubMed

    Sharma, Sam K; Hiratsuka, Takahiro; Hara, Hisashi; Milsom, Jeffrey W

    2018-06-01

     Complex colorectal polyps or those positioned in difficult anatomic locations are an endoscopic therapeutic challenge. Underwater endoscopic submucosal dissection (UESD) is a potential technical solution to facilitate efficient polyp removal. In addition, endoscopic tissue retraction has been confined to limited methods of varying efficacy and complexity. The aim of this study was to evaluate the efficiency of a unique UESD technique for removing complex polyps using double-balloon-assisted retraction (R).  Using fresh ex-vivo porcine rectum, 4-cm polyps were created using electrosurgery and positioned at "6 o'clock" within an established ESD model. Six resections were performed in each group. Underwater techniques were facilitated using a novel double-balloon platform (Dilumen, Lumendi, Westport, Connecticut, United States).  UESD-R had a significantly shorter total procedural time than cap-assisted ESD and UESD alone (24 vs. 58 vs. 56 mins). UESD-R produced a dissection time on average of 5 minutes, attributed to the retraction provided. There was also a subjective significant reduction in electrosurgical smoke with the underwater techniques contributing to improved visualization.  Here we report the first ex-vivo experience of a unique double-balloon endoscopic platform optimized for UESD with tissue traction capability. UESD-R removed complex lesions in significantly shorter time than conventional means. The combined benefits of UESD and retraction appeared to be additive when tackling complex polyps and should be studied further.

  18. 30 CFR 57.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... Extraneous Electricity-Surface and Underground § 57.6605 Isolation of blasting circuits. Lead wires and... shall be protected from sources of stray or static electricity. Blasting circuits shall be protected...

  19. 30 CFR 57.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... Extraneous Electricity-Surface and Underground § 57.6605 Isolation of blasting circuits. Lead wires and... shall be protected from sources of stray or static electricity. Blasting circuits shall be protected...

  20. 30 CFR 57.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... Extraneous Electricity-Surface and Underground § 57.6605 Isolation of blasting circuits. Lead wires and... shall be protected from sources of stray or static electricity. Blasting circuits shall be protected...

  1. 30 CFR 57.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Extraneous Electricity-Surface and Underground § 57.6605 Isolation of blasting circuits. Lead wires and... shall be protected from sources of stray or static electricity. Blasting circuits shall be protected...

  2. 46 CFR 169.670 - Circuit breakers.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... Gross Tons § 169.670 Circuit breakers. Each circuit breaker must be of the manually reset type designed for— (a) Inverse time delay; (b) Instantaneous short circuit protection; and (c) Repeated opening of... 46 Shipping 7 2010-10-01 2010-10-01 false Circuit breakers. 169.670 Section 169.670 Shipping COAST...

  3. ESD as a Means to Strengthen the Sustainable Management of Marginal Drylands in Egypt

    ERIC Educational Resources Information Center

    Salem, Boshra B.

    2012-01-01

    The objective of this article is to present results of and lessons learnt from implementing education for sustainable development (ESD) in marginal drylands, based on experiences from the TEMPUS IV project, Education for Sustainable Development beyond the Campus (EDUCAMP), in Egypt and the multinational project, Sustainable Development of Marginal…

  4. Technical Reliability Studies. EOS/ESD Technology Abstracts

    DTIC Science & Technology

    1982-01-01

    RESISTANT BIPOLAR TRANSISTOR DESIGN AND ITS APPLICATIONS TO LINEAR INTEGRATED CIRCUITS 16145 MODULE ELECTROSTATIC DISCHARGE SIMULATOR 15786 SOME...T.M. 16476 STATIC DISCHARGE MODELING TECHNIQUES FOR EVALUATION OF INTEGRATED (FET) CIRCUIT DESTRUCTION 16145 MODULE ELECTAOSTATIC DISCHARGE SIMULATOR...PLASTIC LSI CIRCUITS PRklE, L.A., II 16145 MODULE ELECTROSTATIC DISCHARGE SIMULATOR PRICE, R.D. 13455 EVALUATION OF PLASTIC LSI CIRCUITS PSHAENICH, A

  5. NASA Workmanship Hot Topics: Water Soluble Flux and ESD Charge Device Model

    NASA Technical Reports Server (NTRS)

    Plante, Jeannette F.

    2009-01-01

    This slide presentation reviews two topics of interest to NASA Workmanship: (1) Water Soluble Flux (WSF) and Electrostatic Discharge (ESD) safety. In the first topic, WSF, the presentation reviews voiding and the importance of cleanliness in using WSF for welding and soldering operations. The second topic reviews the NASA-HDBK-8739.21 for Human Body Model, and Machine Model safety methods, and challenges associated with the Charged Device Model (CDM)

  6. 30 CFR 75.1323 - Blasting circuits.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ...) Blasting circuits shall be protected from sources of stray electric current. (b) Detonators made by...) Each wire connection in a blasting circuit shall be— (1) Properly spliced; and (2) Separated from other connections in the circuit to prevent accidental contact and arcing. (h) Uninsulated connections in each...

  7. 30 CFR 75.1323 - Blasting circuits.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ...) Blasting circuits shall be protected from sources of stray electric current. (b) Detonators made by...) Each wire connection in a blasting circuit shall be— (1) Properly spliced; and (2) Separated from other connections in the circuit to prevent accidental contact and arcing. (h) Uninsulated connections in each...

  8. 46 CFR 111.30-17 - Protection of instrument circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... circuit of a current transformer must not be fused, and the circuit from a current transformer to a device that is not in the switchboard must have a high voltage protector to short the transformer during an...

  9. 46 CFR 111.30-17 - Protection of instrument circuits.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... circuit of a current transformer must not be fused, and the circuit from a current transformer to a device that is not in the switchboard must have a high voltage protector to short the transformer during an...

  10. 46 CFR 111.30-17 - Protection of instrument circuits.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... circuit of a current transformer must not be fused, and the circuit from a current transformer to a device that is not in the switchboard must have a high voltage protector to short the transformer during an...

  11. 46 CFR 111.30-17 - Protection of instrument circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... circuit of a current transformer must not be fused, and the circuit from a current transformer to a device that is not in the switchboard must have a high voltage protector to short the transformer during an...

  12. 46 CFR 111.30-17 - Protection of instrument circuits.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... circuit of a current transformer must not be fused, and the circuit from a current transformer to a device that is not in the switchboard must have a high voltage protector to short the transformer during an...

  13. Electronic control circuits: A compilation

    NASA Technical Reports Server (NTRS)

    1973-01-01

    A compilation of technical R and D information on circuits and modular subassemblies is presented as a part of a technology utilization program. Fundamental design principles and applications are given. Electronic control circuits discussed include: anti-noise circuit; ground protection device for bioinstrumentation; temperature compensation for operational amplifiers; hybrid gatling capacitor; automatic signal range control; integrated clock-switching control; and precision voltage tolerance detector.

  14. 30 CFR 75.900-2 - Approved circuit schemes.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... device installed in the main secondary circuit at the source transformer may be used to provide undervoltage protection for each circuit that receives power from that transformer. (c) One circuit breaker may...

  15. 30 CFR 75.900-2 - Approved circuit schemes.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... device installed in the main secondary circuit at the source transformer may be used to provide undervoltage protection for each circuit that receives power from that transformer. (c) One circuit breaker may...

  16. 30 CFR 75.900-2 - Approved circuit schemes.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... device installed in the main secondary circuit at the source transformer may be used to provide undervoltage protection for each circuit that receives power from that transformer. (c) One circuit breaker may...

  17. 30 CFR 75.900-2 - Approved circuit schemes.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... device installed in the main secondary circuit at the source transformer may be used to provide undervoltage protection for each circuit that receives power from that transformer. (c) One circuit breaker may...

  18. 30 CFR 75.900-2 - Approved circuit schemes.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... device installed in the main secondary circuit at the source transformer may be used to provide undervoltage protection for each circuit that receives power from that transformer. (c) One circuit breaker may...

  19. Impacts of ESD Reliability by Different Layout Engineering in the 0.25-μm 60-V High-Voltage LDMOS Devices

    NASA Astrophysics Data System (ADS)

    Chen, Shen-Li; Lin, Chun-Ju; Yu-Ting, Huang

    2018-02-01

    How to effectively enhance the reliability robustness in high-voltage (HV) BCD [(bipolar) complementary metal-oxide semiconductor (CMOS) diffusion metaloxide semiconductor (DMOS)] processes is an important issue. Influences of layouttype dependences on anti-electrostatic discharge (ESD) robustness in a 0.25-μm 60-V process will be studied in this chapter, which includes, in part (1), the traditional striped-type n-channel lateral-diffused MOSFET (nLDMOS), waffle-type nLDMOS, and nLDMOS embedded with a "p-n-p"-arranged silicon-controlled rectifier (SCR) devices in the drain side; and in part (2) a p-channel LDMOS (pLDMOS) with an embedded "p-n-p-n-p"-arranged-type SCR in the drain side (diffusion regions of the drain side is P+-N+-P+-N+-P+). Then, these LDMOS devices are used to evaluate the influence of layout architecture on trigger voltage (Vt1), holding voltage (Vh), and secondary breakdown current (It2). Eventually, the sketching of the layout pattern of a HV LDMOS is a very important issue in the anti-ESD consideration. Also, in part (1), the waffle-type nLDMOS DUT contributes poorly to It2 robustness due to the non-uniform turned-on phenomenon and a narrow channel width per unit finger. Therefore, the It2 robustness of a waffle-type nLDMOS device is decreased about 17% as compared to a traditional striped-type nLDMOS device (reference DUT-1). The ESD abilities of traditional stripedtype and waffle-type nLDMOS devices with an embedded SCR ("p-n-p"-manner arrangement in the drain side) are better than a traditional nLDMOS 224.4% in average. Noteworthy, the nLDMOS-SCR with the "p-n-p" -arranged-type in the drainend is a good structure for the anti-ESD reliability especially in HV usages. Furthermore, in part (2) this layout manner of P+ discrete-island distributions in the drain-side have some impacts on the anti-ESD and anti-latch-up (LU) immunities. All of their It2 values have reached above 6 A; however, the major repercussion is that the Vh value will be

  20. The dc power circuits: A compilation

    NASA Technical Reports Server (NTRS)

    1972-01-01

    A compilation of reports concerning power circuits is presented for the dissemination of aerospace information to the general public as part of the NASA Technology Utilization Program. The descriptions for the electronic circuits are grouped as follows: dc power supplies, power converters, current-voltage power supply regulators, overload protection circuits, and dc constant current power supplies.

  1. 30 CFR 75.800-1 - Circuit breakers; location.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit breakers; location. 75.800-1 Section 75.800-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY... § 75.800-1 Circuit breakers; location. Circuit breakers protecting high-voltage circuits entering an...

  2. 30 CFR 57.12025 - Grounding circuit enclosures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Electricity Surface and Underground § 57.12025 Grounding circuit enclosures. All metal enclosing or encasing electrical circuits shall be grounded or provided with equivalent protection. This requirement does not apply... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Grounding circuit enclosures. 57.12025 Section...

  3. 30 CFR 75.900-1 - Circuit breakers; location.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Circuit breakers; location. 75.900-1 Section 75.900-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY... Alternating Current Circuits § 75.900-1 Circuit breakers; location. Circuit breakers used to protect low-and...

  4. 30 CFR 75.800-2 - Approved circuit schemes.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... necessary protection to the circuits required by § 75.800: (a) Ground check relays may be used for undervoltage protection if the relay coils are designed to trip the circuit breaker when line voltage decreases to 40 percent to 60 percent of the nominal line voltage; (b) Ground trip relays on resistance...

  5. 30 CFR 75.800-2 - Approved circuit schemes.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... necessary protection to the circuits required by § 75.800: (a) Ground check relays may be used for undervoltage protection if the relay coils are designed to trip the circuit breaker when line voltage decreases to 40 percent to 60 percent of the nominal line voltage; (b) Ground trip relays on resistance...

  6. Binary-selectable detector holdoff circuit

    NASA Technical Reports Server (NTRS)

    Kadrmas, K. A.

    1974-01-01

    High-speed switching circuit protects detectors from sudden, extremely-intense backscattered radiation that results from short-range atmospheric dust layers, or low-level clouds, entering laser/radar field of view. Function of circuit is to provide computer-controlled switching of photodiode detector, preamplifier power-supply voltages, in approximately 10 nanoseconds.

  7. Analysing Key Debates in Education and Sustainable Development in Relation to ESD Practice in Viet Nam

    ERIC Educational Resources Information Center

    Balls, Emily

    2016-01-01

    This article is based on qualitative field research carried out in Ha Noi, Viet Nam, in 2013 for an MA dissertation in Education and International Development at the UCL Institute of Education. It analyses interpretations of education for sustainable development (ESD) in Viet Nam, relating these to key debates around instrumental and democratic…

  8. Values, Beliefs and Norms that Foster Chilean and German Pupils' Commitment to Protect Biodiversity

    ERIC Educational Resources Information Center

    Menzel, Susanne; Bogeholz, Susanne

    2010-01-01

    Fostering young people's commitment to protect biodiversity is an important goal of Education for Sustainable Development (ESD) in both, industrial countries and designated biodiversity hotspots. However, little empirical evidence exists to describe factors that influence such commitments. Based on the Value-Belief-Norm (VBN) theory, 15 to…

  9. 46 CFR 111.75-5 - Lighting branch circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 46 Shipping 4 2010-10-01 2010-10-01 false Lighting branch circuits. 111.75-5 Section 111.75-5 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Lighting Circuits and Protection § 111.75-5 Lighting branch circuits. (a) Loads. A...

  10. Leakage current-induced effects in the silicon microstrip and gas electron multiplier readout chain and their compensation method

    NASA Astrophysics Data System (ADS)

    Zubrzycka, W.; Kasinski, K.

    2018-04-01

    Leakage current flowing into the charge sensitive amplifier (CSA) is a common issue in many radiation detection systems as it can increase overall system noise, shift a DC baseline or even lead a recording channel to instability. The commonly known leakage current contributor is a detector, however other system components like wires or an input protection circuit may become a serious problem. Compensation of the leakage current resulting from the electrostatic discharge (ESD) protection circuit by properly sizing its components is possible only for a narrow temperature range. Moreover, the leakage current from external sources can be significantly larger. Many applications, especially High Energy Physics (HEP) experiments, require a fast baseline restoration for high input hit rates by applying either a low-value feedback resistor or a high feedback resistance combined with a pulsed reset circuit. Leakage current flowing in the feedback in conjunction with a large feedback resistance supplied with a pulsed reset results in a significant voltage offset between the CSA input and output which can cause problems (e.g. fake hits or instability). This paper shows an issue referred to the leakage current of the ESD protection circuit flowing into the input amplifier. The following analysis and proposed solution is a result of the time and energy readout ASIC project realization for the Compressed Baryonic Matter (CBM) experiment at FAIR (Facility for Antiproton and Ion Research) in Darmstadt, Germany. This chip is purposed to work with microstrip and gaseous detectors, with high average input pulses frequencies (250 kHit/s per channel) and the possibility to process input charge of both polarities. We present measurements of the test structure fabricated in UMC 180 nm technology and propose a solution addressing leakage current related issues. This work combines the leakage current compensation capabilities at the CSA level with high, controllable value of the amplifier

  11. An IO block array in a radiation-hardened SOI SRAM-based FPGA

    NASA Astrophysics Data System (ADS)

    Yan, Zhao; Lihua, Wu; Xiaowei, Han; Yan, Li; Qianli, Zhang; Liang, Chen; Guoquan, Zhang; Jianzhong, Li; Bo, Yang; Jiantou, Gao; Jian, Wang; Ming, Li; Guizhai, Liu; Feng, Zhang; Xufeng, Guo; Kai, Zhao; Chen, Stanley L.; Fang, Yu; Zhongli, Liu

    2012-01-01

    We present an input/output block (IOB) array used in the radiation-hardened SRAM-based field-programmable gate array (FPGA) VS1000, which is designed and fabricated with a 0.5 μm partially depleted silicon-on-insulator (SOI) logic process at the CETC 58th Institute. Corresponding with the characteristics of the FPGA, each IOB includes a local routing pool and two IO cells composed of a signal path circuit, configurable input/output buffers and an ESD protection network. A boundary-scan path circuit can be used between the programmable buffers and the input/output circuit or as a transparent circuit when the IOB is applied in different modes. Programmable IO buffers can be used at TTL/CMOS standard levels. The local routing pool enhances the flexibility and routability of the connection between the IOB array and the core logic. Radiation-hardened designs, including A-type and H-type body-tied transistors and special D-type registers, improve the anti-radiation performance. The ESD protection network, which provides a high-impulse discharge path on a pad, prevents the breakdown of the core logic caused by the immense current. These design strategies facilitate the design of FPGAs with different capacities or architectures to form a series of FPGAs. The functionality and performance of the IOB array is proved after a functional test. The radiation test indicates that the proposed VS1000 chip with an IOB array has a total dose tolerance of 100 krad(Si), a dose survivability rate of 1.5 × 1011 rad(Si)/s, and a neutron fluence immunity of 1 × 1014 n/cm2.

  12. 30 CFR 56.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... Extraneous Electricity § 56.6605 Isolation of blasting circuits. Lead wires and blasting lines shall be... sources of stray or static electricity. Blasting circuits shall be protected from any contact between...

  13. 30 CFR 56.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... Extraneous Electricity § 56.6605 Isolation of blasting circuits. Lead wires and blasting lines shall be... sources of stray or static electricity. Blasting circuits shall be protected from any contact between...

  14. 30 CFR 56.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... Extraneous Electricity § 56.6605 Isolation of blasting circuits. Lead wires and blasting lines shall be... sources of stray or static electricity. Blasting circuits shall be protected from any contact between...

  15. 30 CFR 56.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... Extraneous Electricity § 56.6605 Isolation of blasting circuits. Lead wires and blasting lines shall be... sources of stray or static electricity. Blasting circuits shall be protected from any contact between...

  16. 30 CFR 56.6605 - Isolation of blasting circuits.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Extraneous Electricity § 56.6605 Isolation of blasting circuits. Lead wires and blasting lines shall be... sources of stray or static electricity. Blasting circuits shall be protected from any contact between...

  17. Extended evaluation on the ES-D3 cell differentiation assay combined with the BeWo transport model, to predict relative developmental toxicity of triazole compounds.

    PubMed

    Li, Hequn; Flick, Burkhard; Rietjens, Ivonne M C M; Louisse, Jochem; Schneider, Steffen; van Ravenzwaay, Bennard

    2016-05-01

    The mouse embryonic stem D3 (ES-D3) cell differentiation assay is based on the morphometric measurement of cardiomyocyte differentiation and is a promising tool to detect developmental toxicity of compounds. The BeWo transport model, consisting of BeWo b30 cells grown on transwell inserts and mimicking the placental barrier, is useful to determine relative placental transport velocities of compounds. We have previously demonstrated the usefulness of the ES-D3 cell differentiation assay in combination with the in vitro BeWo transport model to predict the relative in vivo developmental toxicity potencies of a set of reference azole compounds. To further evaluate this combined in vitro toxicokinetic and toxicodynamic approach, we combined ES-D3 cell differentiation data of six novel triazoles with relative transport rates obtained from the BeWo model and compared the obtained ranking to the developmental toxicity ranking as derived from in vivo data. The data show that the combined in vitro approach provided a correct prediction for in vivo developmental toxicity, whereas the ES-D3 cell differentiation assay as stand-alone did not. In conclusion, we have validated the combined in vitro approach for developmental toxicity, which we have previously developed with a set of reference azoles, for a set of six novel triazoles. We suggest that this combined model, which takes both toxicodynamic and toxicokinetic aspects into account, should be further validated for other chemical classes of developmental toxicants.

  18. Electrical short circuit and current overload tests on aircraft wiring

    NASA Technical Reports Server (NTRS)

    Cahill, Patricia

    1995-01-01

    The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.

  19. Overload protection system

    NASA Technical Reports Server (NTRS)

    Nagano, S.

    1979-01-01

    Overload protection circuit utilizes one circuit for suspending inverter action when load abnormality is detected and second circuit to monitor clearance of abnormality. Device wastes no power during normal operating conditions and responds instantaneously when abnormality is cleared.

  20. Studying the secondary coolant circuit rupture protection algorithm for the Novovoronezh NPP Unit 5 on a full-scale training simulator

    NASA Astrophysics Data System (ADS)

    Kharchenko, K. S.; Vitkovskii, I. L.

    2014-02-01

    Performance of the secondary coolant circuit rupture algorithm in different operating modes of the Novovoronezh NPP Unit 5 is considered by carrying out studies on a full-scale training simulator. The revealed shortcomings of the algorithm causing excessive actuations of the protection are pointed out, and recommendations for removing them are outlined.

  1. The European Virtual Seminar on Sustainable Development as an Opportunity for Staff ESD Competence Development within University Curricula

    ERIC Educational Resources Information Center

    de Kraker, Joop; Dlouhá, Jana; Machackova Henderson, Laura; Kapitulcinová, Dana

    2017-01-01

    Purpose: The purpose of this paper is to assess the current and potential value of the European Virtual Seminar on Sustainable Development (EVS) as an opportunity for professional development in Education for Sustainable Development (ESD) for teaching staff at university level. Design/methodology/approach: The paper presents and reflects on the…

  2. 46 CFR 111.70-5 - Heater circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... REQUIREMENTS Motor Circuits, Controllers, and Protection § 111.70-5 Heater circuits. (a) If an enclosure for a motor, master switch, or other equipment has an electric heater inside the enclosure that is energized.... (b) If the location of the enclosure for a motor, master switch, or other equipment for deck...

  3. Computation of an ESD-induced E-field Envirnoment and Definition of a Current Injector Test set-up at Equipment Level

    NASA Astrophysics Data System (ADS)

    Marque, J. P.; Issac, F.; Parmantier, J. P.; Bertuol, S.

    1998-11-01

    The ESD-induced electromagnetic field on a S/C is computed using the 3D PIC code GEODE. Typical E-field waveforms are deduced and a new susceptibility test at equipment level is proposed as an alternative to the plane wave approach.

  4. Electrostatic Discharge Effects on Thin Film Resistors

    NASA Technical Reports Server (NTRS)

    Sampson, Michael J.; Hull, Scott M.

    1999-01-01

    Recently, open circuit failures of individual elements in thin film resistor networks have been attributed to electrostatic discharge (ESD) effects. This paper will discuss the investigation that came to this conclusion and subsequent experimentation intended to characterize design factors that affect the sensitivity of resistor elements to ESD. The ESD testing was performed using the standard human body model simulation. Some of the design elements to be evaluated were: trace width, trace length (and thus width to length ratio), specific resistivity of the trace (ohms per square) and resistance value. However, once the experiments were in progress, it was realized that the ESD sensitivity of most of the complex patterns under evaluation was determined by other design and process factors such as trace shape and termination pad spacing. This paper includes pictorial examples of representative ESD failure sites, and provides some options for designing thin film resistors that are ESD resistant. The risks of ESD damage are assessed and handling precautions suggested.

  5. Colorectal endoscopic submucosal dissection (ESD) in the West - when can satisfactory results be obtained? A single-operator learning curve analysis.

    PubMed

    Spychalski, Michał; Skulimowski, Aleksander; Dziki, Adam; Saito, Yutaka

    2017-12-01

    Up to date we lack a detailed description of the colorectal endoscopic submucosal dissection (ESD) learning curve, that would represent the experience of the Western center. The aim of this study was to define the critical points of the learning curve and to draw up lesions qualification guidelines tailored to the endoscopists experience. We have carried out a single center prospective study. Between June 2013 and December 2016, 228 primary colorectal lesions were managed by ESD procedure. In order to create a learning curve model and to carry out the analysis the cases were divided into six periods, each consisting of 38 cases. The overall en bloc resection rate was 79.39%. The lowest en bloc resection rate (52.36%) was observed in the first period. After completing 76 procedures, the resection rate surged to 86% and it was accompanied by the significant increase in the mean procedure speed of ≥9 cm 2 /h. Lesions localization and diameter had a signification impact on the outcomes. After 76 procedures, en bloc resection rate of 90.9 and 90.67% were achieved for the left side of colon and rectum, respectively. In the right side of colon statistically significant lower resection rate of 67.57% was observed. We have proved that in the setting of the Western center, colorectal ESD can yield excellent results. It seems that the key to the success during the learning period is 'tailoring' lesions qualification guidelines to the experience of the endoscopist, as lesions diameter and localization highly influence the outcomes.

  6. 30 CFR 75.802 - Protection of high-voltage circuits extending underground.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... serve as a grounding conductor for the frames of all high-voltage equipment supplied power from that... stationary electric equipment if: (1) Such circuits are either steel armored or installed in grounded, rigid steel conduit throughout their entire length; or, (2) The voltage of such circuits is nominally 2,400...

  7. 30 CFR 75.802 - Protection of high-voltage circuits extending underground.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... serve as a grounding conductor for the frames of all high-voltage equipment supplied power from that... stationary electric equipment if: (1) Such circuits are either steel armored or installed in grounded, rigid steel conduit throughout their entire length; or, (2) The voltage of such circuits is nominally 2,400...

  8. Challenging the Concept of Ethical Literacy within Education for Sustainable Development (ESD): Storytelling as a Method within Sustainability Didactics

    ERIC Educational Resources Information Center

    Franck, Olof; Osbeck, Christina

    2018-01-01

    Ethical literacy seems to be used, within Education for Sustainable Development (ESD), in various ways, some more general and others morally specific, emphasising individuals' responsibility. The overarching aim of this paper is to present some prerequisites for the development of narrative methods that focus on the vision of a good society…

  9. 30 CFR 75.800-3 - Testing, examination and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... High-Voltage Distribution § 75.800-3 Testing, examination and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting underground high-voltage circuits...

  10. Results Of Insulation Resistance Between Solar Cell String Gaps Without RTV Adhesive Grout After Electrostatic Discharge Tests With Cover Glass Flashover

    NASA Astrophysics Data System (ADS)

    Hoang, Bao; Wong, Frankie; Redick, Tod; Masui, Hirokazu; Endo, Taishi; Toyoda, Kazuhiro; Cho, Mengu

    2011-10-01

    A series of electrostatic discharge (ESD) tests was performed on solar array test coupons consisting of Advanced Triple Junction InGaP2/InGaAs/Ge solar cells. The motivation for these tests was to evaluate the effects of ESD on solar array design without room temperature vulcanized (RTV) adhesive grout between the string-to-string parallel gaps. To investigate the threshold of permanently sustained secondary arcs, various combinations of gap width, load voltage and string current were tested in a vacuum chamber equipped with an electron beam gun. This ESD test program included the ESD test circuit with simulated panel coverglass flashover. Although ESD events did not result in permanent sustained arcs, the insulation resistance between strings was found to decrease as the number of secondary arcs accumulated in the gap.

  11. 30 CFR 75.800-4 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Underground High-Voltage Distribution § 75.800-4 Testing, examination, and maintenance of circuit breakers... adjustment of all circuit breakers protecting high-voltage circuits which enter any underground area of the...

  12. 46 CFR 58.25-55 - Overcurrent protection for steering-gear systems.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... overcurrent protection except short-circuit protection that is instantaneous and rated at 400% to 500% of— (1... for steering-gear systems. (a) Each feeder circuit for steering must be protected by a circuit breaker... motor for an alternating-current motor. (b) No feeder circuit for steering may have any overcurrent...

  13. Electrostatic Potential Generated During Extracorporeal Pump Prime Circulation Before Cardiopulmonary Bypass Initiation

    PubMed Central

    Newton, Haley S.; Niles, Scott D.; Ploessl, James; Richenbacher, Wayne

    2007-01-01

    Abstract: The development of electrostatic potentials generated during cardiopulmonary bypass (CPB) procedures using polyvinylchloride (PVC) tubing in conjunction with roller pumps has been previously documented. The resulting damage from the electrostatic discharge (ESD) has been reported to affect gas transfer devices, but details of potential damage to electronic components commonly used during extracorporeal circulation have not been similarly described. The purpose of this study was to measure the ability of a triboelectric potential to be generated from a primed, circulating, adult CPB pump before the initiation of CPB. Two identical adult CPB circuits were assembled: one incorporating a roller pump and the second incorporating a centrifugal pump mechanism. Primed pumps were circulated (1–6 LPM), and evidence of generated triboelectric potentials was evaluated using a digital multimeter (Fluke 8062 A). The ESD generated from an adult CPB circuit using a roller head configuration elicited a charge in excess of 600 DC V. An identical circuit constructed with a centrifugal pump mechanism did not produce any measurable charge. Sensitive electrical components in the CPB hardware platform may be damaged by ESD potential spikes of this magnitude. Preventative measures, such as circuit charge dissipation, may reduce the potential for such damage when using PVC tubing. PMID:17486872

  14. 30 CFR 77.800-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ..., examination, and maintenance of circuit breakers; procedures. (a) Circuit breakers and their auxiliary devices protecting high-voltage circuits to portable or mobile equipment shall be tested and examined at least once... circuit breaker and its auxiliary devices, and such repairs or adjustments as are indicated by such tests...

  15. Biogeochemical Cycles for Combining Chemical Knowledge and ESD Issues in Greek Secondary Schools Part II: Assessing the Impact of the Intervention

    ERIC Educational Resources Information Center

    Koutalidi, Sophia; Psallidas, Vassilis; Scoullos, Michael

    2016-01-01

    In searching for effective ways to combine science/chemical education with EE/ESD, new didactic materials were designed and produced focussing on biogeochemical cycles and their connection to sustainable development. The materials were experimentally applied in 16 Greek schools under the newly introduced compulsory "school project" which…

  16. DOE Office of Scientific and Technical Information (OSTI.GOV)

    Sterczewski, L. A., E-mail: lukasz.sterczewski@pwr.edu.pl; Grzelczak, M. P.; Plinski, E. F.

    In this paper, we present an electronic circuit used to bias a photoconductive antenna that generates terahertz radiation. The working principles and the design process for the device are discussed in detail. The noise and shape of the wave measurements for a built device are considered. Furthermore, their impact on a terahertz pulse and its spectra is also examined. The proposed implementation is simple to build, robust and offers a real improvement over THz instrumentation due to the frequency tuning. Additionally, it provides for galvanic isolation and ESD protection.

  17. 30 CFR 75.601-1 - Short circuit protection; ratings and settings of circuit breakers.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... (amperes) 14 50 12 75 10 150 8 200 6 300 4 500 3 600 2 800 1 1,000 1/0 1,250 2/0 1,500 3/0 2,000 4/0 2,500... of circuit breakers. 75.601-1 Section 75.601-1 Mineral Resources MINE SAFETY AND HEALTH ADMINISTRATION, DEPARTMENT OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS-UNDERGROUND COAL MINES...

  18. Comparison between the effects of positive noncatastrophic HMB ESD stress in n-channel and p-channel power MOSFET's

    NASA Astrophysics Data System (ADS)

    Zupac, Dragan; Kosier, Steven L.; Schrimpf, Ronald D.; Galloway, Kenneth F.; Baum, Keith W.

    1991-10-01

    The effect of noncatastrophic positive human body model (HBM) electrostatic discharge (ESD) stress on n-channel power MOSFETs is radically different from that on p-channel MOSFETs. In n-channel transistors, the stress causes negative shifts of the current-voltage characteristics indicative of positive charge trapping in the gate oxide. In p-channel transistors, the stress increases the drain-to-source leakage current, probably due to localized avalanche electron injection from the p-doped drain.

  19. Overload protection for switching regulators

    NASA Technical Reports Server (NTRS)

    Lachochi, E.

    1980-01-01

    Circuit protects all output lines of switching regulator against overloads without requiring current sensors on every line. If overload is sensed, device short circuits bias on switching transistor so that power is rapidly cut off from loads. Circuit also includes delay network to inhibit erroneous operation during startup.

  20. Starting the Pluralistic Tradition of Teaching? Effects of Education for Sustainable Development (ESD) on Pre-Service Teachers' Views on Teaching about Sustainable Development

    ERIC Educational Resources Information Center

    Andersson, Klas

    2017-01-01

    There is currently a well-established belief among politicians, scholars and university representatives that educational systems can produce positive attitudes towards sustainable development (SD) among citizens. This article investigates whether Education for Sustainable Development (ESD) in teacher education has effects on pre-service teachers'…

  1. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... protecting low- and medium-voltage circuits serving portable or mobile three-phase alternating current... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

  2. 30 CFR 77.900-1 - Testing, examination, and maintenance of circuit breakers; procedures.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... protecting low- and medium-voltage circuits serving portable or mobile three-phase alternating current... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

  3. 30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... protecting low- and medium-voltage circuits serving three-phase alternating current equipment and such record... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

  4. 30 CFR 77.900-2 - Testing, examination, and maintenance of circuit breakers; record.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... protecting low- and medium-voltage circuits serving three-phase alternating current equipment and such record... AND SURFACE WORK AREAS OF UNDERGROUND COAL MINES Low- and Medium-Voltage Alternating Current Circuits...

  5. A parylene coating process for hybrid circuits

    NASA Technical Reports Server (NTRS)

    1976-01-01

    The parylene coating process developed during this program consists of (1) obtaining a hybrid cover with a hole in it, (2) sealing of the circuit with a hole in the cover, (3) parylene coating through the hole with the external leads protected from parylene by appropriate fixturing, and (4) sealing of the hole by soldering a pretinned kovar tab. Development of the above process required optimization of the parylene coater parameters to obtain a uniform consistent coating which could offer adequate protection to the circuits, fixture design for packages of various types, determination of the size of the deposition hole, and the amount of dimer charge per run, a process to hermetically seal the deposition holes and establishment of quality control techniques or acceptance criteria for the deposited film.

  6. Programming mRNA decay to modulate synthetic circuit resource allocation

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Venturelli, Ophelia S.; Tei, Mika; Bauer, Stefan

    Synthetic circuits embedded in host cells compete with cellular processes for limited intracellular resources. Here we show how funnelling of cellular resources, after global transcriptome degradation by the sequence-dependent endoribonuclease MazF, to a synthetic circuit can increase production. Target genes are protected from MazF activity by recoding the gene sequence to eliminate recognition sites, while preserving the amino acid sequence. The expression of a protected fluorescent reporter and flux of a high-value metabolite are significantly enhanced using this genome-scale control strategy. Proteomics measurements discover a host factor in need of protection to improve resource redistribution activity. A computational model demonstratesmore » that the MazF mRNA-decay feedback loop enables proportional control of MazF in an optimal operating regime. Transcriptional profiling of MazF-induced cells elucidates the dynamic shifts in transcript abundance and discovers regulatory design elements. Altogether, our results suggest that manipulation of cellular resource allocation is a key control parameter for synthetic circuit design.« less

  7. Programming mRNA decay to modulate synthetic circuit resource allocation

    DOE PAGES

    Venturelli, Ophelia S.; Tei, Mika; Bauer, Stefan; ...

    2017-04-26

    Synthetic circuits embedded in host cells compete with cellular processes for limited intracellular resources. Here we show how funnelling of cellular resources, after global transcriptome degradation by the sequence-dependent endoribonuclease MazF, to a synthetic circuit can increase production. Target genes are protected from MazF activity by recoding the gene sequence to eliminate recognition sites, while preserving the amino acid sequence. The expression of a protected fluorescent reporter and flux of a high-value metabolite are significantly enhanced using this genome-scale control strategy. Proteomics measurements discover a host factor in need of protection to improve resource redistribution activity. A computational model demonstratesmore » that the MazF mRNA-decay feedback loop enables proportional control of MazF in an optimal operating regime. Transcriptional profiling of MazF-induced cells elucidates the dynamic shifts in transcript abundance and discovers regulatory design elements. Altogether, our results suggest that manipulation of cellular resource allocation is a key control parameter for synthetic circuit design.« less

  8. 49 CFR 236.51 - Track circuit requirements.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

  9. 49 CFR 236.51 - Track circuit requirements.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

  10. 49 CFR 236.51 - Track circuit requirements.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

  11. 49 CFR 236.51 - Track circuit requirements.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

  12. 49 CFR 236.51 - Track circuit requirements.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ..., appliance or other protective device, which provides a bypath for the electric current, or (2) As result of..., locomotive, or car occupies any part of a track circuit, including fouling section of turnout except turnouts...

  13. Electronic circuits and systems: A compilation. [including integrated circuits, logic circuits, varactor diode circuits, low pass filters, and optical equipment circuits

    NASA Technical Reports Server (NTRS)

    1975-01-01

    Technological information is presented electronic circuits and systems which have potential utility outside the aerospace community. Topics discussed include circuit components such as filters, converters, and integrators, circuits designed for use with specific equipment or systems, and circuits designed primarily for use with optical equipment or displays.

  14. Analysis of Safety Protection Measures for Maintenance Work of 500 kV Double-Circuit Transmission Lines on Same Tower

    NASA Astrophysics Data System (ADS)

    Yang, Qi; Zou, Dehua; Zhang, Jianjun; Li, Hui; Chen, Jianping; Li, Jinliang

    2017-05-01

    Four transmission lines on the same tower are widely used because of their obvious economic and social benefits. But it also has high power supply reliability, so the choice of reasonable maintenance mode is particularly important. In this paper, we deducted the maintenance influence of the energized line to non-energized line, calculated and analyzed protection measures of non-energized singular line of 500kV double-circuit transmission line on the same tower with ATP software, and calculated field intensity distribution of typical operating position of the energized double-circuit transmission line with the finite element software. The calculation shows that when using the outage maintenance method, hanging both ground current and personal security line can reduce the current flowing through the operator’s body effectively. When using the live maintenance method, the field intensity of operator body strengths up to 383.69kV/m, The operator needs to wear shielding cloth with at least 43.08 dB shielding efficiency, in order to meet the security requirements.

  15. Optimizing the switching time for 400 kV SF6 circuit breakers

    NASA Astrophysics Data System (ADS)

    Ciulica, D.

    2018-01-01

    This paper presents real-time voltage and current analysis for optimizing the wave switching point of the circuit breaker SF6. Circuit Breaker plays an important role in power systems. It provides protection for equipment in embedded stations in transport networks. SF6 Circuit Breaker is very important equipment in Power Systems, which is used for up to 400 kV due to its excellent performance. The controlled switching is used to eliminate transient modes and electrodynamic and dielectric charges in the network at manual switching of capacitor, shunt reactors and power transformers. These effects reduce the reliability and lifetime of the equipment installed on the network, or may lead to erroneous protection.

  16. Architectures and Design for Next-Generation Hybrid Circuit/Packet Networks

    NASA Astrophysics Data System (ADS)

    Vadrevu, Sree Krishna Chaitanya

    Internet traffic is increasing rapidly at an annual growth rate of 35% with aggregate traffic exceeding several Exabyte's per month. The traffic is also becoming heterogeneous in bandwidth and quality-of-service (QoS) requirements with growing popularity of cloud computing, video-on-demand (VoD), e-science, etc. Hybrid circuit/packet networks which can jointly support circuit and packet services along with the adoption of high-bit-rate transmission systems form an attractive solution to address the traffic growth. 10 Gbps and 40 Gbps transmission systems are widely deployed in telecom backbone networks such as Comcast, AT&T, etc., and network operators are considering migration to 100 Gbps and beyond. This dissertation proposes robust architectures, capacity migration strategies, and novel service frameworks for next-generation hybrid circuit/packet architectures. In this dissertation, we study two types of hybrid circuit/packet networks: a) IP-over-WDM networks, in which the packet (IP) network is overlaid on top of the circuit (optical WDM) network and b) Hybrid networks in which the circuit and packet networks are deployed side by side such as US DoE's ESnet. We investigate techniques to dynamically migrate capacity between the circuit and packet sections by exploiting traffic variations over a day, and our methods show that significant bandwidth savings can be obtained with improved reliability of services. Specifically, we investigate how idle backup circuit capacity can be used to support packet services in IP-over-WDM networks, and similarly, excess capacity in packet network to support circuit services in ESnet. Control schemes that enable our mechanisms are also discussed. In IP-over-WDM networks, with upcoming 100 Gbps and beyond, dedicated protection will induce significant under-utilization of backup resources. We investigate design strategies to loan idle circuit backup capacity to support IP/packet services. However, failure of backup circuits will

  17. 33 CFR 183.455 - Overcurrent protection: General.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ....455 Overcurrent protection: General. (a) Each ungrounded current-carrying conductor must be protected... breaker or fuse must be placed at the source of power for each circuit or conductor except: (1) If it is... seven inches of the source of power for each circuit or conductor measured along the conductor. (2) If...

  18. 33 CFR 183.455 - Overcurrent protection: General.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ....455 Overcurrent protection: General. (a) Each ungrounded current-carrying conductor must be protected... breaker or fuse must be placed at the source of power for each circuit or conductor except: (1) If it is... seven inches of the source of power for each circuit or conductor measured along the conductor. (2) If...

  19. 40 CFR 413.80 - Applicability: Description of the printed circuit board subcategory.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 40 Protection of Environment 28 2010-07-01 2010-07-01 true Applicability: Description of the printed circuit board subcategory. 413.80 Section 413.80 Protection of Environment ENVIRONMENTAL PROTECTION AGENCY (CONTINUED) EFFLUENT GUIDELINES AND STANDARDS ELECTROPLATING POINT SOURCE CATEGORY Printed...

  20. Improved Thermal-Switch Disks Protect Batteries

    NASA Technical Reports Server (NTRS)

    Darcy, Eric; Bragg, Bobby

    1990-01-01

    Improved thermal-switch disks help protect electrical batteries against high currents like those due to short circuits or high demands for power in circuits supplied by batteries. Protects batteries against excessive temperatures. Centered by insulating fiberglass washer. Contains conductive polymer that undergoes abrupt increase in electrical resistance when excessive current raises its temperature above specific point. After cooling, polymer reverts to low resistance. Disks reusable.

  1. What Kind of Actions Are Appropriate? Eco-School Teachers' and Instructors' Ranking of Sustainability-Promoting Actions as Content in Education for Sustainable Development (ESD)

    ERIC Educational Resources Information Center

    Stagell, Ulrica; Almers, Ellen; Askerlund, Per; Apelqvist, Magnus

    2014-01-01

    Based on the consideration that learning about different action alternatives and strategies are essential parts of ESD, this quantitative study focuses Eco-School teachers' and instructors' views on including different sustainability-promoting actions in teaching practices. Direct actions, and actions that take place in the private sphere were…

  2. Package Holds Five Monolithic Microwave Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Mysoor, Narayan R.; Decker, D. Richard; Olson, Hilding M.

    1996-01-01

    Packages protect and hold monolithic microwave integrated circuit (MMIC) chips while providing dc and radio-frequency (RF) electrical connections for chips undergoing development. Required to be compact, lightweight, and rugged. Designed to minimize undesired resonances, reflections, losses, and impedance mismatches.

  3. 46 CFR 169.682 - Distribution and circuit loads.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... the rating of the overcurrent protective device, computed using the greater of— (1) The lamp sizes to be installed; or (2) 50 watts per outlet. (b) Circuits supplying electrical discharge lamps must be...

  4. Electrometer Amplifier With Overload Protection

    NASA Technical Reports Server (NTRS)

    Woeller, F. H.; Alexander, R.

    1986-01-01

    Circuit features low noise, input offset, and high linearity. Input preamplifier includes input-overload protection and nulling circuit to subtract dc offset from output. Prototype dc amplifier designed for use with ion detector has features desirable in general laboratory and field instrumentation.

  5. Integral Battery Power Limiting Circuit for Intrinsically Safe Applications

    NASA Technical Reports Server (NTRS)

    Burns, Bradley M.; Blalock, Norman N.

    2010-01-01

    A circuit topology has been designed to guarantee the output of intrinsically safe power for the operation of electrical devices in a hazardous environment. This design uses a MOSFET (metal oxide semiconductor field-effect transistor) as a switch to connect and disconnect power to a load. A test current is provided through a separate path to the load for monitoring by a comparator against a preset threshold level. The circuit is configured so that the test current will detect a fault in the load and open the switch before the main current can respond. The main current passes through the switch and then an inductor. When a fault occurs in the load, the current through the inductor cannot change immediately, but the voltage drops immediately to safe levels. The comparator detects this drop and opens the switch before the current in the inductor has a chance to respond. This circuit protects both the current and voltage from exceeding safe levels. Typically, this type of protection is accomplished by a fuse or a circuit breaker, but in order for a fuse or a circuit breaker to blow or trip, the current must exceed the safe levels momentarily, which may be just enough time to ignite anything in a hazardous environment. To prevent this from happening, a fuse is typically current-limited by the addition of the resistor to keep the current within safe levels while the fuse reacts. The use of a resistor is acceptable for non-battery applications where the wasted energy and voltage drop across the resistor can be tolerated. The use of the switch and inductor minimizes the wasted energy. For example, a circuit runs from a 3.6-V battery that must be current-limited to 200 mA. If the circuit normally draws 10 mA, then an 18-ohm resistor would drop 180 mV during normal operation, while a typical switch (0.02 ohm) and inductor (0.97 ohm) would only drop 9.9 mV. From a power standpoint, the current-limiting resistor protection circuit wastes about 18 times more power than the

  6. Photomultiplier circuit including means for rapidly reducing the sensitivity thereof. [and protection from radiation damage

    NASA Technical Reports Server (NTRS)

    Mcclenahan, J. O. (Inventor)

    1974-01-01

    A simple, reliable and inexpensive control circuit is described for rapidly reducing the bias voltage across one or more of the dynode stages of a photomultiplier, to substantially decrease its sensitivity to incoming light at those times where excess light intensity might damage the tube. The control circuit comprises a switching device, such as a silicon controlled rectifier (SCR), coupled between a pair of the electrodes in the tube, preferably the cathode and first dynode, or the first and second dynodes, the switching device operating in response to a trigger pulse applied to its gate to short circuit the two electrodes. To insure the desired reduction in sensitivity, two switching stages, the devices be employed between two of the electrode stages, the devices being operated simultaneously to short circuit both stages.

  7. 46 CFR 111.77-1 - Overcurrent protection.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ...-GENERAL REQUIREMENTS Appliances and Appliance Circuits § 111.77-1 Overcurrent protection. If a circuit supplies only one appliance or device, the rating or setting of the branch circuit overcurrent device must not be more than 150 percent of the rating of the appliance or device, or 15 amperes, whichever is...

  8. Commutation circuit for an HVDC circuit breaker

    DOEpatents

    Premerlani, William J.

    1981-01-01

    A commutation circuit for a high voltage DC circuit breaker incorporates a resistor capacitor combination and a charging circuit connected to the main breaker, such that a commutating capacitor is discharged in opposition to the load current to force the current in an arc after breaker opening to zero to facilitate arc interruption. In a particular embodiment, a normally open commutating circuit is connected across the contacts of a main DC circuit breaker to absorb the inductive system energy trapped by breaker opening and to limit recovery voltages to a level tolerable by the commutating circuit components.

  9. Commutation circuit for an HVDC circuit breaker

    DOEpatents

    Premerlani, W.J.

    1981-11-10

    A commutation circuit for a high voltage DC circuit breaker incorporates a resistor capacitor combination and a charging circuit connected to the main breaker, such that a commutating capacitor is discharged in opposition to the load current to force the current in an arc after breaker opening to zero to facilitate arc interruption. In a particular embodiment, a normally open commutating circuit is connected across the contacts of a main DC circuit breaker to absorb the inductive system energy trapped by breaker opening and to limit recovery voltages to a level tolerable by the commutating circuit components. 13 figs.

  10. 30 CFR 77.900 - Low- and medium-voltage circuits serving portable or mobile three-phase alternating current...

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... portable or mobile three-phase alternating current equipment; circuit breakers. 77.900 Section 77.900... mobile three-phase alternating current equipment; circuit breakers. Low- and medium-voltage circuits supplying power to portable or mobile three-phase alternating current equipment shall be protected by...

  11. 46 CFR 169.683 - Overcurrent protection, general.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... time delay; (2) Instantaneous short circuit protection; and (3) Repeated opening of the circuit in... above the full-load rating for continuous rated machines or the overload rating for special rated machines. ...

  12. 46 CFR 169.683 - Overcurrent protection, general.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... time delay; (2) Instantaneous short circuit protection; and (3) Repeated opening of the circuit in... above the full-load rating for continuous rated machines or the overload rating for special rated machines. ...

  13. 46 CFR 169.683 - Overcurrent protection, general.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... time delay; (2) Instantaneous short circuit protection; and (3) Repeated opening of the circuit in... above the full-load rating for continuous rated machines or the overload rating for special rated machines. ...

  14. In-situ short circuit protection system and method for high-energy electrochemical cells

    DOEpatents

    Gauthier, Michel; Domroese, Michael K.; Hoffman, Joseph A.; Lindeman, David D.; Noel, Joseph-Robert-Gaetan; Radewald, Vern E.; Rouillard, Jean; Rouillard, Roger; Shiota, Toshimi; Trice, Jennifer L.

    2000-01-01

    An in-situ thermal management system for an energy storage device. The energy storage device includes a plurality of energy storage cells each being coupled in parallel to common positive and negative connections. Each of the energy storage cells, in accordance with the cell's technology, dimensions, and thermal/electrical properties, is configured to have a ratio of energy content-to-contact surface area such that thermal energy produced by a short-circuit in a particular cell is conducted to a cell adjacent the particular cell so as to prevent the temperature of the particular cell from exceeding a breakdown temperature. In one embodiment, a fuse is coupled in series with each of a number of energy storage cells. The fuses are activated by a current spike capacitively produced by a cell upon occurrence of a short-circuit in the cell, thereby electrically isolating the short-circuited cell from the common positive and negative connections.

  15. In-situ short-circuit protection system and method for high-energy electrochemical cells

    DOEpatents

    Gauthier, Michel; Domroese, Michael K.; Hoffman, Joseph A.; Lindeman, David D.; Noel, Joseph-Robert-Gaetan; Radewald, Vern E.; Rouillard, Jean; Rouillard, Roger; Shiota, Toshimi; Trice, Jennifer L.

    2003-04-15

    An in-situ thermal management system for an energy storage device. The energy storage device includes a plurality of energy storage cells each being coupled in parallel to common positive and negative connections. Each of the energy storage cells, in accordance with the cell's technology, dimensions, and thermal/electrical properties, is configured to have a ratio of energy content-to-contact surface area such that thermal energy produced by a short-circuit in a particular cell is conducted to a cell adjacent the particular cell so as to prevent the temperature of the particular cell from exceeding a breakdown temperature. In one embodiment, a fuse is coupled in series with each of a number of energy storage cells. The fuses are activated by a current spike capacitively produced by a cell upon occurrence of a short-circuit in the cell, thereby electrically isolating the short-circuited cell from the common positive and negative connections.

  16. An Overview of Dynamic Contact Resistance Measurement of HV Circuit Breakers

    NASA Astrophysics Data System (ADS)

    Bhole, A. A.; Gandhare, W. Z.

    2016-06-01

    With the deregulation of the electrical power industry, utilities and service companies are operating in a changing business environment. High voltage circuit breakers are extremely important for the function of modern electric power supply systems. The need to predict the proper function of circuit breaker grew over the years as the transmission networks expanded. The maintenance of circuit breakers deserves special consideration because of their importance for routine switching and for protection of other equipments. Electric transmission system breakups and equipment destruction can occur if a circuit breaker fails to operate because of a lack of preventive maintenance. Dynamic Contact Resistance Measurement (DCRM) is known as an effective technique for assessing the condition of power circuit breakers contacts and operating mechanism. This paper gives a general review about DCRM. It discusses the practical case studies on use of DCRM for condition assessment of high voltage circuit breakers.

  17. 46 CFR 111.51-3 - Protection of vital equipment.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... plant configurations. (b)Overcurrent protective devices must be installed so that: (1) A short-circuit on a circuit that is not vital to the propulsion, control, or safety of the vessel does not trip equipment that is vital; and (2) A short-circuit on a circuit that is vital to the propulsion, control, or...

  18. Measuring circuit

    DOEpatents

    Sun, Shan C.; Chaprnka, Anthony G.

    1977-01-11

    An automatic gain control circuit functions to adjust the magnitude of an input signal supplied to a measuring circuit to a level within the dynamic range of the measuring circuit while a log-ratio circuit adjusts the magnitude of the output signal from the measuring circuit to the level of the input signal and optimizes the signal-to-noise ratio performance of the measuring circuit.

  19. Temperature-Adaptive Circuits on Reconfigurable Analog Arrays

    NASA Technical Reports Server (NTRS)

    Stoica, Adrian; Zebulum, Ricardo S.; Keymeulen, Didier; Ramesham, Rajeshuni; Neff, Joseph; Katkoori, Srinivas

    2006-01-01

    Demonstration of a self-reconfigurable Integrated Circuit (IC) that would operate under extreme temperature (-180 C and 120 C) and radiation (300krad), without the protection of thermal controls and radiation shields. Self-Reconfigurable Electronics platform: a) Evolutionary Processor (EP) to run reconfiguration mechanism; b) Reconfigurable chip (FPGA, FPAA, etc).

  20. Electrostatic Discharge (ESD) Simulator Experiment (Testing of Some Switches/Relays for Application to an ESD Simulation Circuit)

    DTIC Science & Technology

    1983-10-01

    will be: V(t) = 4,100 et/RC = 4,100 e 5/100 3,900 Volts Note that failure of a device during such test will classify the device as being Class 3 of DOD...Volts) 50 mV/small div., 50 nsec 0.1 mV/small div., 50 nsec (Inverted) NU-N E U Figure 12: (Charging Voltage: +1000 Volts) Figure 13: (Charging Voltage...Ij stchari I-,, i-1)401)0 1 It (uIrllis wi th vovy rt’~dIt- e l b (’i a, Ch .11it(! 11 1~ lit u t’ ~ 0 KV vult*.ge, I’Zinge anld at hw nFgrs 3~s. it

  1. Project Circuits in a Basic Electric Circuits Course

    ERIC Educational Resources Information Center

    Becker, James P.; Plumb, Carolyn; Revia, Richard A.

    2014-01-01

    The use of project circuits (a photoplethysmograph circuit and a simple audio amplifier), introduced in a sophomore-level electric circuits course utilizing active learning and inquiry-based methods, is described. The development of the project circuits was initiated to promote enhanced engagement and deeper understanding of course content among…

  2. Electronic circuits

    NASA Technical Reports Server (NTRS)

    1976-01-01

    Twenty-nine circuits and circuit techniques developed for communications and instrumentation technology are described. Topics include pulse-code modulation, phase-locked loops, data coding, data recording, detection circuits, logic circuits, oscillators, and amplifiers.

  3. Efficient Performance of Electrostatic Spray-Deposited TiO2 Blocking Layers in Dye-Sensitized Solar Cells after Swift Heavy Ion Beam Irradiation.

    PubMed

    Sudhagar, P; Asokan, K; Jung, June Hyuk; Lee, Yong-Gun; Park, Suil; Kang, Yong Soo

    2011-12-01

    A compact TiO2 layer (~1.1 μm) prepared by electrostatic spray deposition (ESD) and swift heavy ion beam (SHI) irradiation using oxygen ions onto a fluorinated tin oxide (FTO) conducting substrate showed enhancement of photovoltaic performance in dye-sensitized solar cells (DSSCs). The short circuit current density (Jsc = 12.2 mA cm(-2)) of DSSCs was found to increase significantly when an ESD technique was applied for fabrication of the TiO2 blocking layer, compared to a conventional spin-coated layer (Jsc = 8.9 mA cm(-2)). When SHI irradiation of oxygen ions of fluence 1 × 10(13) ions/cm(2) was carried out on the ESD TiO2, it was found that the energy conversion efficiency improved mainly due to the increase in open circuit voltage of DSSCs. This increased energy conversion efficiency seems to be associated with improved electronic energy transfer by increasing the densification of the blocking layer and improving the adhesion between the blocking layer and the FTO substrate. The adhesion results from instantaneous local melting of the TiO2 particles. An increase in the electron transport from the blocking layer may also retard the electron recombination process due to the oxidized species present in the electrolyte. These findings from novel treatments using ESD and SHI irradiation techniques may provide a new tool to improve the photovoltaic performance of DSSCs.

  4. Efficient Performance of Electrostatic Spray-Deposited TiO2 Blocking Layers in Dye-Sensitized Solar Cells after Swift Heavy Ion Beam Irradiation

    PubMed Central

    2011-01-01

    A compact TiO2 layer (~1.1 μm) prepared by electrostatic spray deposition (ESD) and swift heavy ion beam (SHI) irradiation using oxygen ions onto a fluorinated tin oxide (FTO) conducting substrate showed enhancement of photovoltaic performance in dye-sensitized solar cells (DSSCs). The short circuit current density (Jsc = 12.2 mA cm-2) of DSSCs was found to increase significantly when an ESD technique was applied for fabrication of the TiO2 blocking layer, compared to a conventional spin-coated layer (Jsc = 8.9 mA cm-2). When SHI irradiation of oxygen ions of fluence 1 × 1013 ions/cm2 was carried out on the ESD TiO2, it was found that the energy conversion efficiency improved mainly due to the increase in open circuit voltage of DSSCs. This increased energy conversion efficiency seems to be associated with improved electronic energy transfer by increasing the densification of the blocking layer and improving the adhesion between the blocking layer and the FTO substrate. The adhesion results from instantaneous local melting of the TiO2 particles. An increase in the electron transport from the blocking layer may also retard the electron recombination process due to the oxidized species present in the electrolyte. These findings from novel treatments using ESD and SHI irradiation techniques may provide a new tool to improve the photovoltaic performance of DSSCs. PMID:27502653

  5. 46 CFR 129.380 - Overcurrent protection.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... protection must be provided for each ungrounded conductor, to open the electric circuit if the current reaches a value that causes an excessive or dangerous temperature in the conductor or its insulation. (b) Each conductor of a control, interlock, or indicator circuit, such as a conductor for an instrument...

  6. Control technology for integrated circuit fabrication at Micro-Circuit Engineering, Incorporated, West Palm Beach, Florida

    NASA Astrophysics Data System (ADS)

    Mihlan, G. I.; Mitchell, R. I.; Smith, R. K.

    1984-07-01

    A survey to assess control technology for integrated circuit fabrication was conducted. Engineering controls included local and general exhaust ventilation, shielding, and personal protective equipment. Devices or work stations that contained toxic materials that were potentially dangerous were controlled by local exhaust ventilation. Less hazardous areas were controlled by general exhaust ventilation. Process isolation was used in the plasma etching, low pressure chemical vapor deposition, and metallization operations. Shielding was used in ion implantation units to control X-ray emissions, in contact mask alignes to limit ultraviolet (UV) emissions, and in plasma etching units to control radiofrequency and UV emissions. Most operations were automated. Use of personal protective equipment varied by job function.

  7. Electric vehicle drive train with contactor protection

    DOEpatents

    Konrad, Charles E.; Benson, Ralph A.

    1994-01-01

    A drive train for an electric vehicle includes a traction battery, a power drive circuit, a main contactor for connecting and disconnecting the traction battery and the power drive circuit, a voltage detector across contacts of the main contactor, and a controller for controlling the main contactor to prevent movement of its contacts to the closed position when the voltage across the contacts exceeds a predetermined threshold, to thereby protect the contacts of the contactor. The power drive circuit includes an electric traction motor and a DC-to-AC inverter with a capacitive input filter. The controller also inhibits the power drive circuit from driving the motor and thereby discharging the input capacitor if the contacts are inadvertently opened during motoring. A precharging contactor is controlled to charge the input filter capacitor prior to closing the main contactor to further protect the contacts of the main contactor.

  8. Electric vehicle drive train with contactor protection

    DOEpatents

    Konrad, C.E.; Benson, R.A.

    1994-11-29

    A drive train for an electric vehicle includes a traction battery, a power drive circuit, a main contactor for connecting and disconnecting the traction battery and the power drive circuit, a voltage detector across contacts of the main contactor, and a controller for controlling the main contactor to prevent movement of its contacts to the closed position when the voltage across the contacts exceeds a predetermined threshold, to thereby protect the contacts of the contactor. The power drive circuit includes an electric traction motor and a DC-to-AC inverter with a capacitive input filter. The controller also inhibits the power drive circuit from driving the motor and thereby discharging the input capacitor if the contacts are inadvertently opened during motoring. A precharging contactor is controlled to charge the input filter capacitor prior to closing the main contactor to further protect the contacts of the main contactor. 3 figures.

  9. 46 CFR 183.380 - Overcurrent protection.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ...) Overcurrent protection must be provided for each ungrounded conductor for the purpose of opening the electric circuit if the current reaches a value that causes an excessive or dangerous temperature in the conductor or conductor insulation. (b) The grounded conductor of a circuit must not be disconnected by a switch...

  10. 46 CFR 183.380 - Overcurrent protection.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ...) Overcurrent protection must be provided for each ungrounded conductor for the purpose of opening the electric circuit if the current reaches a value that causes an excessive or dangerous temperature in the conductor or conductor insulation. (b) The grounded conductor of a circuit must not be disconnected by a switch...

  11. 14 CFR 25.1357 - Circuit protective devices.

    Code of Federal Regulations, 2010 CFR

    2010-01-01

    ... system or connected equipment. (b) The protective and control devices in the generating system must be designed to de-energize and disconnect faulty power sources and power transmission equipment from their...

  12. Evaluation of biasing and protection circuitry components for cryogenic MMIC low-noise amplifiers

    NASA Astrophysics Data System (ADS)

    Lamb, James W.

    2014-05-01

    Millimeter-wave integrated circuits with gate lengths as short as 35 nm are demonstrating extremely low-noise performance, especially when cooled to cryogenic temperatures. These operate at low voltages and are susceptible to damage from electrostatic discharge and improper biasing, as well as being sensitive to low-level interference. Designing a protection circuit for low voltages and temperatures is challenging because there is very little data available on components that may be suitable. Extensive testing at low temperatures yielded a set of components and a circuit topology that demonstrates the required level of protection for critical MMICs and similar devices. We present a circuit that provides robust protection for low voltage devices from room temperature down to 4 K.

  13. Adaptive protection algorithm and system

    DOEpatents

    Hedrick, Paul [Pittsburgh, PA; Toms, Helen L [Irwin, PA; Miller, Roger M [Mars, PA

    2009-04-28

    An adaptive protection algorithm and system for protecting electrical distribution systems traces the flow of power through a distribution system, assigns a value (or rank) to each circuit breaker in the system and then determines the appropriate trip set points based on the assigned rank.

  14. 14 CFR 29.1357 - Circuit protective devices.

    Code of Federal Regulations, 2010 CFR

    2010-01-01

    ... faults or serious malfunction of the system or connected equipment. (b) The protective and control devices in the generating system must be designed to de-energize and disconnect faulty power sources and...

  15. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, David M.

    1996-01-01

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit.

  16. 30 CFR 75.705-10 - Tying into energized high-voltage surface circuits.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ....705-10 Tying into energized high-voltage surface circuits. If the work of forming an additional... performing such work must wear and employ all of the protective equipment and clothing required under the... designed for such purpose and must be adequately insulated and be maintained to protect such person from...

  17. Compensated gain control circuit for buck regulator command charge circuit

    DOEpatents

    Barrett, D.M.

    1996-11-05

    A buck regulator command charge circuit includes a compensated-gain control signal for compensating for changes in the component values in order to achieve optimal voltage regulation. The compensated-gain control circuit includes an automatic-gain control circuit for generating a variable-gain control signal. The automatic-gain control circuit is formed of a precision rectifier circuit, a filter network, an error amplifier, and an integrator circuit. 5 figs.

  18. 30 CFR 57.12003 - Trailing cable overload protection.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Trailing cable overload protection. 57.12003... Electricity Surface and Underground § 57.12003 Trailing cable overload protection. Individual overload protection or short circuit protection shall be provided for the trailing cables of mobile equipment. ...

  19. Integrated circuit electrometer and sweep circuitry for an atmospheric probe

    NASA Technical Reports Server (NTRS)

    Zimmerman, L. E.

    1971-01-01

    The design of electrometer circuitry using an integrated circuit operational amplifier with a MOSFET input is described. Input protection against static voltages is provided by a dual ultra low leakage diode or a neon lamp. Factors affecting frequency response leakage resistance, and current stability are discussed, and methods are suggested for increasing response speed and for eliminating leakage resistance and current instabilities. Based on the above, two practical circuits, one having a linear response and the other a logarithmic response, were designed and evaluated experimentally. The design of a sweep circuit to implement mobility measurements using atmospheric probes is presented. A triangular voltage waveform is generated and shaped to contain a step in voltage from zero volts in both positive and negative directions.

  20. Overload protection system for power inverter

    NASA Technical Reports Server (NTRS)

    Nagano, S. (Inventor)

    1977-01-01

    An overload protection system for a power inverter utilized a first circuit for monitoring current to the load from the power inverter to detect an overload and a control circuit to shut off the power inverter, when an overload condition was detected. At the same time, a monitoring current inverter was turned on to deliver current to the load at a very low power level. A second circuit monitored current to the load, from the monitoring current inverter, to hold the power inverter off through the control circuit, until the overload condition was cleared so that the control circuit may be deactivated in order for the power inverter to be restored after the monitoring current inverter is turned off completely.

  1. Electrostatic Discharge Training Manual

    DTIC Science & Technology

    1980-09-01

    CAN BE MOLDED INTO FORMED SHAPES. FIBERBOARD, MELAMINE LAMINATES AND OTHER MATERIALS (LAMINATED OR HOMOGENEOUS) CAN BE CONSTRUCTED INTO BOXES AND...COVERED WITH, ESD PROTECTIVE MATERIALS SUCH AS METAL, MIL-B-81705 TYPE II, MIL-P- 82646 (REFERENCES 17, 16), MELAMINE LAMINATES OR OTHER ESD PROTECTIVE...CONDUCTANCE IN AVALANCHE MICROWAVE OSCILLATORS", IEEE TRANSACTIONS ON ELECTRON DEVICES, ED-i5, JUNE 1968. 32. HOLM, R., ELECTRIC CONTACTS HANDBOOK, BERLIN

  2. Three-phase short circuit calculation method based on pre-computed surface for doubly fed induction generator

    NASA Astrophysics Data System (ADS)

    Ma, J.; Liu, Q.

    2018-02-01

    This paper presents an improved short circuit calculation method, based on pre-computed surface to determine the short circuit current of a distribution system with multiple doubly fed induction generators (DFIGs). The short circuit current, injected into power grid by DFIG, is determined by low voltage ride through (LVRT) control and protection under grid fault. However, the existing methods are difficult to calculate the short circuit current of DFIG in engineering practice due to its complexity. A short circuit calculation method, based on pre-computed surface, was proposed by developing the surface of short circuit current changing with the calculating impedance and the open circuit voltage. And the short circuit currents were derived by taking into account the rotor excitation and crowbar activation time. Finally, the pre-computed surfaces of short circuit current at different time were established, and the procedure of DFIG short circuit calculation considering its LVRT was designed. The correctness of proposed method was verified by simulation.

  3. Minutiae Matching with Privacy Protection Based on the Combination of Garbled Circuit and Homomorphic Encryption

    PubMed Central

    Li, Mengxing; Zhao, Jian; Yang, Mei; Kang, Lijun; Wu, Lili

    2014-01-01

    Biometrics plays an important role in authentication applications since they are strongly linked to holders. With an increasing growth of e-commerce and e-government, one can expect that biometric-based authentication systems are possibly deployed over the open networks in the near future. However, due to its openness, the Internet poses a great challenge to the security and privacy of biometric authentication. Biometric data cannot be revoked, so it is of paramount importance that biometric data should be handled in a secure way. In this paper we present a scheme achieving privacy-preserving fingerprint authentication between two parties, in which fingerprint minutiae matching algorithm is completed in the encrypted domain. To improve the efficiency, we exploit homomorphic encryption as well as garbled circuits to design the protocol. Our goal is to provide protection for the security of template in storage and data privacy of two parties in transaction. The experimental results show that the proposed authentication protocol runs efficiently. Therefore, the protocol can run over open networks and help to alleviate the concerns on security and privacy of biometric applications over the open networks. PMID:24711729

  4. Minutiae matching with privacy protection based on the combination of garbled circuit and homomorphic encryption.

    PubMed

    Li, Mengxing; Feng, Quan; Zhao, Jian; Yang, Mei; Kang, Lijun; Wu, Lili

    2014-01-01

    Biometrics plays an important role in authentication applications since they are strongly linked to holders. With an increasing growth of e-commerce and e-government, one can expect that biometric-based authentication systems are possibly deployed over the open networks in the near future. However, due to its openness, the Internet poses a great challenge to the security and privacy of biometric authentication. Biometric data cannot be revoked, so it is of paramount importance that biometric data should be handled in a secure way. In this paper we present a scheme achieving privacy-preserving fingerprint authentication between two parties, in which fingerprint minutiae matching algorithm is completed in the encrypted domain. To improve the efficiency, we exploit homomorphic encryption as well as garbled circuits to design the protocol. Our goal is to provide protection for the security of template in storage and data privacy of two parties in transaction. The experimental results show that the proposed authentication protocol runs efficiently. Therefore, the protocol can run over open networks and help to alleviate the concerns on security and privacy of biometric applications over the open networks.

  5. Optimization of the Switch Mechanism in a Circuit Breaker Using MBD Based Simulation

    PubMed Central

    Jang, Jin-Seok; Yoon, Chang-Gyu; Ryu, Chi-Young; Kim, Hyun-Woo; Bae, Byung-Tae; Yoo, Wan-Suk

    2015-01-01

    A circuit breaker is widely used to protect electric power system from fault currents or system errors; in particular, the opening mechanism in a circuit breaker is important to protect current overflow in the electric system. In this paper, multibody dynamic model of a circuit breaker including switch mechanism was developed including the electromagnetic actuator system. Since the opening mechanism operates sequentially, optimization of the switch mechanism was carried out to improve the current breaking time. In the optimization process, design parameters were selected from length and shape of each latch, which changes pivot points of bearings to shorten the breaking time. To validate optimization results, computational results were compared to physical tests with a high speed camera. Opening time of the optimized mechanism was decreased by 2.3 ms, which was proved by experiments. Switch mechanism design process can be improved including contact-latch system by using this process. PMID:25918740

  6. Protective carrier for microcircuit devices

    DOEpatents

    Robinson, Lyle A.

    1976-10-26

    An improved protective carrier for microcircuit devices having beam leads wherein a compressible member is disposed on the carrier base beneath and overlapping the periphery of an aperture in a flexible circuit element, the element being adapted to receive and make electrical contact with microcircuit device beam leads, the compressible member disposed or arranged to achieve flexing of the circuit element against the microcircuit device beam leads to conform to variations in thicknesses of the device beam leads or circuit element electrical paths and thereby insure electrical connection between the beam leads and the electrical paths.

  7. 46 CFR 111.50-3 - Protection of conductors.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 46 Shipping 4 2011-10-01 2011-10-01 false Protection of conductors. 111.50-3 Section 111.50-3...-GENERAL REQUIREMENTS Overcurrent Protection § 111.50-3 Protection of conductors. (a) Purpose. The purpose of overcurrent protection for conductors is to open the electric circuit if the current reaches a...

  8. 46 CFR 111.50-3 - Protection of conductors.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 46 Shipping 4 2010-10-01 2010-10-01 false Protection of conductors. 111.50-3 Section 111.50-3...-GENERAL REQUIREMENTS Overcurrent Protection § 111.50-3 Protection of conductors. (a) Purpose. The purpose of overcurrent protection for conductors is to open the electric circuit if the current reaches a...

  9. ADDER CIRCUIT

    DOEpatents

    Jacobsohn, D.H.; Merrill, L.C.

    1959-01-20

    An improved parallel addition unit is described which is especially adapted for use in electronic digital computers and characterized by propagation of the carry signal through each of a plurality of denominationally ordered stages within a minimum time interval. In its broadest aspects, the invention incorporates a fast multistage parallel digital adder including a plurality of adder circuits, carry-propagation circuit means in all but the most significant digit stage, means for conditioning each carry-propagation circuit during the time period in which information is placed into the adder circuits, and means coupling carry-generation portions of thc adder circuit to the carry propagating means.

  10. Color Coding of Circuit Quantities in Introductory Circuit Analysis Instruction

    ERIC Educational Resources Information Center

    Reisslein, Jana; Johnson, Amy M.; Reisslein, Martin

    2015-01-01

    Learning the analysis of electrical circuits represented by circuit diagrams is often challenging for novice students. An open research question in electrical circuit analysis instruction is whether color coding of the mathematical symbols (variables) that denote electrical quantities can improve circuit analysis learning. The present study…

  11. Design of an improved RCD buffer circuit for full bridge circuit

    NASA Astrophysics Data System (ADS)

    Yang, Wenyan; Wei, Xueye; Du, Yongbo; Hu, Liang; Zhang, Liwei; Zhang, Ou

    2017-05-01

    In the full bridge inverter circuit, when the switch tube suddenly opened or closed, the inductor current changes rapidly. Due to the existence of parasitic inductance of the main circuit. Therefore, the surge voltage between drain and source of the switch tube can be generated, which will have an impact on the switch and the output voltage. In order to ab sorb the surge voltage. An improve RCD buffer circuit is proposed in the paper. The peak energy will be absorbed through the buffer capacitor of the circuit. The part energy feedback to the power supply, another part release through the resistor in the form of heat, and the circuit can absorb the voltage spikes. This paper analyzes the process of the improved RCD snubber circuit, According to the specific parameters of the main circuit, a reasonable formula for calculating the resistance capacitance is given. A simulation model will be modulated in Multisim, which compared the waveform of tube voltage and the output waveform of the circuit without snubber circuit with the improved RCD snubber circuit. By comparing and analyzing, it is proved that the improved buffer circuit can absorb surge voltage. Finally, experiments are demonstrated to validate that the correctness of the RC formula and the improved RCD snubber circuit.

  12. ESD coating of copper with TiC and TiB2 based ceramic matrix composites

    NASA Astrophysics Data System (ADS)

    Talas, S.; Mertgenç, E.; Gökçe, B.

    2016-08-01

    In automotive industry, the spot welding is a general practice to join smaller sections of a car. This welding is specifically carried out in short time and in an elevated number with certain pressure applied on copper electrodes. In addition, copper electrodes are expected to endure against cyclic mechanical pressure and temperature that is released during the passage of the current. The deformation and oxidation behaviour of copper electrodes during service appear with increasing temperature of medium and they also need to be cleaned and cooled or replaced for the continuation of joining process. The coating of copper electrodes with ceramic matrix composites can provide alternative excellent high temperature strength and ensures both economic and efficient use of resources. This study shows that the ESD coating of copper electrodes with a continuous film of ceramic phase ensures an improved resistance to thermal effects during the service and the change in content of film may be critical for cyclic alloying.

  13. NASA Standard for Airborne Data: ICARTT Format ESDS-RFC-019

    NASA Astrophysics Data System (ADS)

    Thornhill, A.; Brown, C.; Aknan, A.; Crawford, J. H.; Chen, G.; Williams, E. J.

    2011-12-01

    Airborne field studies generate a plethora of data products in the effort to study atmospheric composition and processes. Data file formats for airborne field campaigns are designed to present data in an understandable and organized way to support collaboration and to document relevant and important meta data. The ICARTT file format was created to facilitate data management during the International Consortium for Atmospheric Research on Transport and Transformation (ICARTT) campaign in 2004 that involved government-agencies and university participants from five countries. Since this mission the ICARTT format has been used in subsequent field campaigns such as Polar Study Using Aircraft Remote Sensing, Surface Measurements and Models of Climates, Chemistry, Aerosols, and Transport (POLARCAT) and the first phase of Deriving Information on Surface Conditions from COlumn and VERtically Resolved Observations Relevant to Air Quality (DISCOVER-AQ). The ICARTT file format has been endorsed as a standard format for airborne data by the Standard Process Group (SPG), one of the Earth Science Data Systems Working Groups (ESDSWG) in 2010. The detailed description of the ICARTT format can be found at http://www-air.larc.nasa.gov/missions/etc/ESDS-RFC-019-v1.00.pdf. The ICARTT data format is an ASCII, comma delimited format that was based on the NASA Ames and GTE file formats. The file header is detailed enough to fully describe the data for users outside of the instrument group and includes a description of the meta data. The ICARTT scanning tools, format structure, implementations, and examples will be presented.

  14. Unstable behaviour of normally-off GaN E-HEMT under short-circuit

    NASA Astrophysics Data System (ADS)

    Martínez, P. J.; Maset, E.; Sanchis-Kilders, E.; Esteve, V.; Jordán, J.; Bta Ejea, J.; Ferreres, A.

    2018-04-01

    The short-circuit capability of power switching devices plays an important role in fault detection and the protection of power circuits. In this work, an experimental study on the short-circuit (SC) capability of commercial 600 V Gallium Nitride enhancement-mode high-electron-mobility transistors (E-HEMT) is presented. A different failure mechanism has been identified for commercial p-doped GaN gate (p-GaN) HEMT and metal-insulator-semiconductor (MIS) HEMT. In addition to the well known thermal breakdown, a premature breakdown is shown on both GaN HEMTs, triggered by hot electron trapping at the surface, which demonstrates that current commercial GaN HEMTs has requirements for improving their SC ruggedness.

  15. Biocompatible circuit-breaker chip for thermal management of biomedical microsystems

    NASA Astrophysics Data System (ADS)

    Luo, Yi; Dahmardeh, Masoud; Takahata, Kenichi

    2015-05-01

    This paper presents a thermoresponsive micro circuit breaker for biomedical applications specifically targeted at electronic intelligent implants. The circuit breaker is micromachined to have a shape-memory-alloy cantilever actuator as a normally closed temperature-sensitive switch to protect the device of interest from overheating, a critical safety feature for smart implants including those that are electrothermally driven with wireless micro heaters. The device is fabricated in a size of 1.5  ×  2.0  ×  0.46 mm3 using biocompatible materials and a chip-based titanium package, exhibiting a nominal cold-state resistance of 14 Ω. The breaker rapidly enters the full open condition when the chip temperature exceeds 63 °C, temporarily breaking the circuit of interest to lower its temperature until chip temperature drops to 51 °C, at which the breaker closes the circuit to allow current to flow through it again, physically limiting the maximum temperature of the circuit. This functionality is tested in combination with a wireless resonant heater powered by radio-frequency electromagnetic radiation, demonstrating self-regulation of heater temperature. The developed circuit-breaker chip operates in a fully passive manner that removes the need for active sensor and circuitry to achieve temperature regulation in a target device, contributing to the miniaturization of biomedical microsystems including electronic smart implants where thermal management is essential.

  16. 33 CFR 183.460 - Overcurrent protection: Special applications.

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ... Requirements § 183.460 Overcurrent protection: Special applications. (a) Each ungrounded output conductor from... conductor is in the main power feed circuit from the battery to an engine cranking motor. The circuit breaker or fuse must be within 72 inches of the battery measured along the conductor, unless, for boats...

  17. 33 CFR 183.460 - Overcurrent protection: Special applications.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... Requirements § 183.460 Overcurrent protection: Special applications. (a) Each ungrounded output conductor from... conductor is in the main power feed circuit from the battery to an engine cranking motor. The circuit breaker or fuse must be within 72 inches of the battery measured along the conductor, unless, for boats...

  18. MOSFET Switching Circuit Protects Shape Memory Alloy Actuators

    NASA Technical Reports Server (NTRS)

    Gummin, Mark A.

    2011-01-01

    A small-footprint, full surface-mount-component printed circuit board employs MOSFET (metal-oxide-semiconductor field-effect transistor) power switches to switch high currents from any input power supply from 3 to 30 V. High-force shape memory alloy (SMA) actuators generally require high current (up to 9 A at 28 V) to actuate. SMA wires (the driving element of the actuators) can be quickly overheated if power is not removed at the end of stroke, which can damage the wires. The new analog driver prevents overheating of the SMA wires in an actuator by momentarily removing power when the end limit switch is closed, thereby allowing complex control schemes to be adopted without concern for overheating. Either an integral pushbutton or microprocessor-controlled gate or control line inputs switch current to the actuator until the end switch line goes from logic high to logic low state. Power is then momentarily removed (switched off by the MOSFET). The analog driver is suited to use with nearly any SMA actuator.

  19. VLSI circuits implementing computational models of neocortical circuits.

    PubMed

    Wijekoon, Jayawan H B; Dudek, Piotr

    2012-09-15

    This paper overviews the design and implementation of three neuromorphic integrated circuits developed for the COLAMN ("Novel Computing Architecture for Cognitive Systems based on the Laminar Microcircuitry of the Neocortex") project. The circuits are implemented in a standard 0.35 μm CMOS technology and include spiking and bursting neuron models, and synapses with short-term (facilitating/depressing) and long-term (STDP and dopamine-modulated STDP) dynamics. They enable execution of complex nonlinear models in accelerated-time, as compared with biology, and with low power consumption. The neural dynamics are implemented using analogue circuit techniques, with digital asynchronous event-based input and output. The circuits provide configurable hardware blocks that can be used to simulate a variety of neural networks. The paper presents experimental results obtained from the fabricated devices, and discusses the advantages and disadvantages of the analogue circuit approach to computational neural modelling. Copyright © 2012 Elsevier B.V. All rights reserved.

  20. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... closed-circuit apparatus; maximum allowable limits. 84.97 Section 84.97 Public Health PUBLIC HEALTH... ACTIVITIES APPROVAL OF RESPIRATORY PROTECTIVE DEVICES Self-Contained Breathing Apparatus § 84.97 Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open...

  1. 42 CFR 84.97 - Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable...

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... closed-circuit apparatus; maximum allowable limits. 84.97 Section 84.97 Public Health PUBLIC HEALTH... ACTIVITIES APPROVAL OF RESPIRATORY PROTECTIVE DEVICES Self-Contained Breathing Apparatus § 84.97 Test for carbon dioxide in inspired gas; open- and closed-circuit apparatus; maximum allowable limits. (a) Open...

  2. Over-voltage protection system and method

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Chi, Song; Dong, Dong; Lai, Rixin

    An over-voltage protection system includes an electronic valve connected across two terminals of a circuit and an over-voltage detection circuit connected across one of the plurality of semiconductor devices for detecting an over-voltage across the circuit. The electronic valve includes a plurality of semiconductor devices connected in series. The over-voltage detection circuit includes a voltage divider circuit connected to a break-over diode in a way to provide a representative low voltage to the break-over diode and an optocoupler configured to receive a current from the break-over diode when the representative low voltage exceeds a threshold voltage of the break-over diodemore » indicating an over-voltage condition. The representative low voltage provided to the break-over diode represents a voltage across the one semiconductor device. A plurality of self-powered gate drive circuits are connected to the plurality of semiconductor devices, wherein the plurality of self-powered gate drive circuits receive over-voltage triggering pulses from the optocoupler during the over-voltage condition and switch on the plurality of semiconductor devices to bypass the circuit.« less

  3. 46 CFR 111.12-11 - Generator protection.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 46 Shipping 4 2013-10-01 2013-10-01 false Generator protection. 111.12-11 Section 111.12-11 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-11 Generator protection. (a...

  4. 46 CFR 111.12-11 - Generator protection.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 46 Shipping 4 2012-10-01 2012-10-01 false Generator protection. 111.12-11 Section 111.12-11 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-11 Generator protection. (a...

  5. 46 CFR 111.12-11 - Generator protection.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 46 Shipping 4 2014-10-01 2014-10-01 false Generator protection. 111.12-11 Section 111.12-11 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-11 Generator protection. (a...

  6. Raman study of bulk-heterojunction morphology in photoactive layers treated with solvent-vapor annealing

    NASA Astrophysics Data System (ADS)

    Onojima, Norio; Ishima, Yasuhisa; Izumi, Daisuke; Takahashi, Kazuyuki

    2018-03-01

    The effect of solvent-vapor annealing (SVA) on bulk-heterojunction morphology in photoactive layers composed of poly(3-hexylthiophene-2,5-diyl) (P3HT) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) was analyzed using Raman spectroscopy. We prepared the photoactive layers by electrostatic spray deposition (ESD) and fabricated organic photovoltaic devices with a conventional cell structure. Although postdeposition annealing can be omitted when the photoactive layer is deposited using ESD under dry condition, the surface is relatively rough owing to the existence of a number of droplet traces. The SVA treatment can eliminate such droplet traces, while excessive SVA resulted in a significant decrease in open-circuit voltage. The Raman study of the bulk-heterojunction morphology demonstrated the accumulation of P3HT molecules on the surface during SVA, which induced the recombination of photogenerated charges at the interface of the cathode/photoactive layer and thereby decreased the open-circuit voltage.

  7. Current limiter circuit system

    DOEpatents

    Witcher, Joseph Brandon; Bredemann, Michael V.

    2017-09-05

    An apparatus comprising a steady state sensing circuit, a switching circuit, and a detection circuit. The steady state sensing circuit is connected to a first, a second and a third node. The first node is connected to a first device, the second node is connected to a second device, and the steady state sensing circuit causes a scaled current to flow at the third node. The scaled current is proportional to a voltage difference between the first and second node. The switching circuit limits an amount of current that flows between the first and second device. The detection circuit is connected to the third node and the switching circuit. The detection circuit monitors the scaled current at the third node and controls the switching circuit to limit the amount of the current that flows between the first and second device when the scaled current is greater than a desired level.

  8. 30 CFR 77.802 - Protection of high-voltage circuits; neutral grounding resistors; disconnecting devices.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... grounded through a suitable resistor at the source transformers, and a grounding circuit, originating at... stationary electrical equipment, if he finds that such exception will not pose a hazard to the miners...

  9. Tantalum capacitor behavior under fast transient overvoltages. [circuit protection against lightning

    NASA Technical Reports Server (NTRS)

    Zill, J. A.; Castle, K. D.

    1974-01-01

    Tantalum capacitors were tested to determine failure time when subjected to short-duration, high-voltage surges caused by lightning strikes. Lightning is of concern to NASA because of possible damage to critical spacecraft circuits. The test was designed to determine the minimum time for tantalum capacitor failure and the amount of overvoltage a capacitor could survive, without permanent damage, in 100 microseconds. All tested exhibited good recovery from the transient one-shot pulses with no failure at any voltage, forward or reverse, in less than 25 microseconds.

  10. Integrated Personal Protective Equipment Standards Support Model

    DTIC Science & Technology

    2008-04-01

    traditional SCBA showed that the distribution of the weight is important as well. Twelve firefighters performed simulated fire -fighting and rescue exercises...respiratory equipment standards and five National Fire Protection Association (NFPA) protective suit, clothing, and respirator standards. The...respirators. The clothing standards were for protective ensembles for urban search and rescue operations, open circuit SCBA for fire and emergency

  11. High energy overcurrent protective device

    DOEpatents

    Praeg, Walter F.

    1982-01-01

    Electrical loads connected to capacitance elements in high voltage direct current systems are protected from damage by capacitance discharge overcurrents by connecting between the capacitance element and the load, a longitudinal inductor comprising a bifilar winding wound about a magnetic core, which forms an incomplete magnetic circuit. A diode is connected across a portion of the bifilar winding which conducts a unidirectional current only. Energy discharged from the capacitance element is stored in the inductor and then dissipated in an L-R circuit including the diode and the coil winding. Multiple high voltage circuits having capacitance elements may be connected to loads through bifilar windings all wound about the aforementioned magnetic core.

  12. Synthesis of Arbitrary Quantum Circuits to Topological Assembly: Systematic, Online and Compact.

    PubMed

    Paler, Alexandru; Fowler, Austin G; Wille, Robert

    2017-09-05

    It is challenging to transform an arbitrary quantum circuit into a form protected by surface code quantum error correcting codes (a variant of topological quantum error correction), especially if the goal is to minimise overhead. One of the issues is the efficient placement of magic state distillation sub circuits, so-called distillation boxes, in the space-time volume that abstracts the computation's required resources. This work presents a general, systematic, online method for the synthesis of such circuits. Distillation box placement is controlled by so-called schedulers. The work introduces a greedy scheduler generating compact box placements. The implemented software, whose source code is available at www.github.com/alexandrupaler/tqec, is used to illustrate and discuss synthesis examples. Synthesis and optimisation improvements are proposed.

  13. Study of Photosensitive Dry Films Absorption for Printed Circuit Boards by Photoacoustic Technique

    NASA Astrophysics Data System (ADS)

    Hernández, R.; Zaragoza, J. A. Barrientos; Jiménez-Pérez, J. L.; Orea, A. Cruz; Correa-Pacheco, Z. N.

    2017-08-01

    In this work, the study of photosensitive dry-type films by photoacoustic technique is proposed. The dry film photoresist is resistant to chemical etching for printed circuit boards such as ferric chloride, sodium persulfate or ammonium, hydrochloric acid. It is capable of faithfully reproducing circuit pattern exposed to ultraviolet light (UV) through a negative. Once recorded, the uncured portion is removed with alkaline solution. It is possible to obtain good results in surface mount circuits with tracks of 5 mm. Furthermore, the solid resin films are formed by three layers, two protective layers and a UV-sensitive optical absorption layer in the range of 325 nm to 405 nm. By means of optical absorption of UV-visible rays emitted by a low-power Xe lamp, the films transform this energy into thermal waves generated by the absorption of optical radiation and subsequently no-radiative de-excitation occurs. The photoacoustic spectroscopy is a useful technique to measure the transmittance and absorption directly. In this study, the optical absorption spectra of the three layers of photosensitive dry-type films were obtained as a function of the wavelength, in order to have a knowledge of the absorber layer and the protective layers. These analyses will give us the physical properties of the photosensitive film, which are very important in curing the dry film for applications in printed circuit boards.

  14. Circuit-based versus full-wave modelling of active microwave circuits

    NASA Astrophysics Data System (ADS)

    Bukvić, Branko; Ilić, Andjelija Ž.; Ilić, Milan M.

    2018-03-01

    Modern full-wave computational tools enable rigorous simulations of linear parts of complex microwave circuits within minutes, taking into account all physical electromagnetic (EM) phenomena. Non-linear components and other discrete elements of the hybrid microwave circuit are then easily added within the circuit simulator. This combined full-wave and circuit-based analysis is a must in the final stages of the circuit design, although initial designs and optimisations are still faster and more comfortably done completely in the circuit-based environment, which offers real-time solutions at the expense of accuracy. However, due to insufficient information and general lack of specific case studies, practitioners still struggle when choosing an appropriate analysis method, or a component model, because different choices lead to different solutions, often with uncertain accuracy and unexplained discrepancies arising between the simulations and measurements. We here design a reconfigurable power amplifier, as a case study, using both circuit-based solver and a full-wave EM solver. We compare numerical simulations with measurements on the manufactured prototypes, discussing the obtained differences, pointing out the importance of measured parameters de-embedding, appropriate modelling of discrete components and giving specific recipes for good modelling practices.

  15. Gate drive latching circuit for an auxiliary resonant commutation circuit

    NASA Technical Reports Server (NTRS)

    Delgado, Eladio Clemente (Inventor); Kheraluwala, Mustansir Hussainy (Inventor)

    1999-01-01

    A gate drive latching circuit for an auxiliary resonant commutation circuit for a power switching inverter includes a current monitor circuit providing a current signal to a pair of analog comparators to implement latching of one of a pair of auxiliary switching devices which are used to provide commutation current for commutating switching inverters in the circuit. Each of the pair of comparators feeds a latching circuit which responds to an active one of the comparators for latching the associated gate drive circuit for one of the pair of auxiliary commutating switches. An initial firing signal is applied to each of the commutating switches to gate each into conduction and the resulting current is monitored to determine current direction and therefore the one of the switches which is carrying current. The comparator provides a latching signal to the one of the auxiliary power switches which is actually conducting current and latches that particular power switch into an on state for the duration of current through the device. The latching circuit is so designed that the only time one of the auxiliary switching devices can be latched on is during the duration of an initial firing command signal.

  16. 46 CFR 111.12-11 - Generator protection.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 46 Shipping 4 2010-10-01 2010-10-01 false Generator protection. 111.12-11 Section 111.12-11...-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-11 Generator protection. (a... shutting down of the prime mover; (2) Have longtime overcurrent trips or relays set as necessary to...

  17. 46 CFR 111.12-11 - Generator protection.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 46 Shipping 4 2011-10-01 2011-10-01 false Generator protection. 111.12-11 Section 111.12-11...-GENERAL REQUIREMENTS Generator Construction and Circuits § 111.12-11 Generator protection. (a... shutting down of the prime mover; (2) Have longtime overcurrent trips or relays set as necessary to...

  18. Effects of Concentration of Nanoscale Tin-Doped Indium Oxide on Electrical Breakdown of High-Resistance Liquid Crystal

    NASA Astrophysics Data System (ADS)

    Liang, Bau-Jy; Liu, Don-Gey; Chang, Chih-Yuan; Shie, Wun-Yi

    2011-05-01

    According to our previous study, a high concentration of nanoscale tin-doped indium oxide (ITO) may be beneficial for protecting liquid crystal (LC) against attacks by electrostatic discharge (ESD). In this study, the influence of high-voltage stresses in an ESD test was investigated for cells doped with different concentrations of ITO. It was found that nano-ITO with a concentration of 0.4% in weight ratio deteriorated the physical properties of LC of transparency transition and charge retention. However, our experiment showed that the capability of ESD protection for the doped LC was still improved at the ITO concentration of 0.4 wt %. This finding supports the proposed model in our previous report. The role of ITO in the LC is not always beneficial, as discussed in this paper.

  19. Thermocouple-Signal-Conditioning Circuit

    NASA Technical Reports Server (NTRS)

    Simon, Richard A.

    1991-01-01

    Thermocouple-signal-conditioning circuit acting in conjunction with thermocouple, exhibits electrical behavior of voltage in series with resistance. Combination part of input bridge circuit of controller. Circuit configured for either of two specific applications by selection of alternative resistances and supply voltages. Includes alarm circuit detecting open circuit in thermocouple and provides off-scale output to signal malfunctions.

  20. Postfabrication Phase Error Correction of Silicon Photonic Circuits by Single Femtosecond Laser Pulses

    DOE PAGES

    Bachman, Daniel; Chen, Zhijiang; Wang, Christopher; ...

    2016-11-29

    Phase errors caused by fabrication variations in silicon photonic integrated circuits are an important problem, which negatively impacts device yield and performance. This study reports our recent progress in the development of a method for permanent, postfabrication phase error correction of silicon photonic circuits based on femtosecond laser irradiation. Using beam shaping technique, we achieve a 14-fold enhancement in the phase tuning resolution of the method with a Gaussian-shaped beam compared to a top-hat beam. The large improvement in the tuning resolution makes the femtosecond laser method potentially useful for very fine phase trimming of silicon photonic circuits. Finally, wemore » also show that femtosecond laser pulses can directly modify silicon photonic devices through a SiO 2 cladding layer, making it the only permanent post-fabrication method that can tune silicon photonic circuits protected by an oxide cladding.« less

  1. Engineering a robust DNA split proximity circuit with minimized circuit leakage

    PubMed Central

    Ang, Yan Shan; Tong, Rachel; Yung, Lin-Yue Lanry

    2016-01-01

    DNA circuit is a versatile and highly-programmable toolbox which can potentially be used for the autonomous sensing of dynamic events, such as biomolecular interactions. However, the experimental implementation of in silico circuit designs has been hindered by the problem of circuit leakage. Here, we systematically analyzed the sources and characteristics of various types of leakage in a split proximity circuit which was engineered to spatially probe for target sites held within close proximity. Direct evidence that 3′-truncated oligonucleotides were the major impurity contributing to circuit leakage was presented. More importantly, a unique strategy of translocating a single nucleotide between domains, termed ‘inter-domain bridging’, was introduced to eliminate toehold-independent leakages while enhancing the strand displacement kinetics across a three-way junction. We also analyzed the dynamics of intermediate complexes involved in the circuit computation in order to define the working range of domain lengths for the reporter toehold and association region respectively. The final circuit design was successfully implemented on a model streptavidin-biotin system and demonstrated to be robust against both circuit leakage and biological interferences. We anticipate that this simple signal transduction strategy can be used to probe for diverse biomolecular interactions when used in conjunction with specific target recognition moieties. PMID:27207880

  2. Development, Integration and Testing of Automated Triggering Circuit for Hybrid DC Circuit Breaker

    NASA Astrophysics Data System (ADS)

    Kanabar, Deven; Roy, Swati; Dodiya, Chiragkumar; Pradhan, Subrata

    2017-04-01

    A novel concept of Hybrid DC circuit breaker having combination of mechanical switch and static switch provides arc-less current commutation into the dump resistor during quench in superconducting magnet operation. The triggering of mechanical and static switches in Hybrid DC breaker can be automatized which can effectively reduce the overall current commutation time of hybrid DC circuit breaker and make the operation independent of opening time of mechanical switch. With this view, a dedicated control circuit (auto-triggering circuit) has been developed which can decide the timing and pulse duration for mechanical switch as well as static switch from the operating parameters. This circuit has been tested with dummy parameters and thereafter integrated with the actual test set up of hybrid DC circuit breaker. This paper deals with the conceptual design of the auto-triggering circuit, its control logic and operation. The test results of Hybrid DC circuit breaker using this circuit have also been discussed.

  3. 46 CFR 111.70-7 - Remote control, interlock, and indicator circuits.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... difference in potential between the external conductors, overcurrent protection need only be at the supply of... to start. (c) Source of potential. The potential for a control, interlock, or indicator circuit must... disconnected from all sources of potential by a disconnect device independent of the motor and controller...

  4. 46 CFR 111.70-7 - Remote control, interlock, and indicator circuits.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... difference in potential between the external conductors, overcurrent protection need only be at the supply of... to start. (c) Source of potential. The potential for a control, interlock, or indicator circuit must... disconnected from all sources of potential by a disconnect device independent of the motor and controller...

  5. 46 CFR 111.70-7 - Remote control, interlock, and indicator circuits.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... difference in potential between the external conductors, overcurrent protection need only be at the supply of... to start. (c) Source of potential. The potential for a control, interlock, or indicator circuit must... disconnected from all sources of potential by a disconnect device independent of the motor and controller...

  6. 46 CFR 111.70-7 - Remote control, interlock, and indicator circuits.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... difference in potential between the external conductors, overcurrent protection need only be at the supply of... to start. (c) Source of potential. The potential for a control, interlock, or indicator circuit must... disconnected from all sources of potential by a disconnect device independent of the motor and controller...

  7. 46 CFR 111.70-7 - Remote control, interlock, and indicator circuits.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... difference in potential between the external conductors, overcurrent protection need only be at the supply of... to start. (c) Source of potential. The potential for a control, interlock, or indicator circuit must... disconnected from all sources of potential by a disconnect device independent of the motor and controller...

  8. Approximate circuits for increased reliability

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Hamlet, Jason R.; Mayo, Jackson R.

    2015-08-18

    Embodiments of the invention describe a Boolean circuit having a voter circuit and a plurality of approximate circuits each based, at least in part, on a reference circuit. The approximate circuits are each to generate one or more output signals based on values of received input signals. The voter circuit is to receive the one or more output signals generated by each of the approximate circuits, and is to output one or more signals corresponding to a majority value of the received signals. At least some of the approximate circuits are to generate an output value different than the referencemore » circuit for one or more input signal values; however, for each possible input signal value, the majority values of the one or more output signals generated by the approximate circuits and received by the voter circuit correspond to output signal result values of the reference circuit.« less

  9. Protection relay of phase-shifting device with thyristor switch for high voltage power transmission lines

    NASA Astrophysics Data System (ADS)

    Lachugin, V. F.; Panfilov, D. I.; Akhmetov, I. M.; Astashev, M. G.; Shevelev, A. V.

    2014-12-01

    Problems of functioning of differential current protection systems of phase shifting devices (PSD) with mechanically changed coefficient of transformation of shunt transformer are analyzed. Requirements for devices of protection of PSD with thyristor switch are formulated. Based on use of nonlinear models of series-wound and shunt transformers of PSD modes of operation of major protection during PSD, switching to zero load operation and to operation under load and during short circuit operation were studied for testing PSD with failures. Use of the principle of duplicating by devices of differential current protection (with realization of functions of breaking) of failures of separate pares of PSD with thyristor switch was substantiated. To ensure protection sensitivity to the shunt transformer winding short circuit, in particular, to a short circuit that is not implemented in the current differential protection for PSD with mechanical switch, the differential current protection reacting to the amount of primary ampere-turns of high-voltage and low-voltage winding of this transformer was designed. Studies have shown that the use of differential current cutoff instead of overcurrent protection for the shunt transformer wndings allows one to provide the sensitivity during thyristor failure with the formation of a short circuit. The results of simulation mode for the PSD with switch thyristor designed to be installed as switching point of Voskhod-Tatarskaya-Barabinsk 220 kV transmission line point out the efficiency of the developed solutions that ensure reliable functioning of the PSD.

  10. Waveshaping electronic circuit

    NASA Technical Reports Server (NTRS)

    Harper, T. P.

    1971-01-01

    Circuit provides output signal with sinusoidal function in response to bipolar transition of input signal. Instantaneous transition shapes into linear rate of change and linear rate of change shapes into sinusoidal rate of change. Circuit contains only active components; therefore, compatibility with integrated circuit techniques is assured.

  11. Design of low loss helix circuits for interference fitted and brazed circuits

    NASA Technical Reports Server (NTRS)

    Jacquez, A.

    1983-01-01

    The RF loss properties and thermal capability of brazed helix circuits and interference fitted circuits were evaluated. The objective was to produce design circuits with minimum RF loss and maximum heat transfer. These circuits were to be designed to operate at 10 kV and at 20 GHz using a gamma a approximately equal to 1.0. This represents a circuit diameter of only 0.75 millimeters. The fabrication of this size circuit and the 0.48 millimeter high support rods required considerable refinements in the assembly techniques and fixtures used on lower frequency circuits. The transition from the helices to the waveguide was designed and the circuits were matched from 20 to 40 GHz since the helix design is a broad band circuit and at a gamma a of 1.0 will operate over this band. The loss measurement was a transmission measurement and therefore had two such transitions. This resulting double-ended match required tuning elements to achieve the broad band match and external E-H tuners at each end to optimize the match for each frequency where the loss measurement was made. The test method used was a substitution method where the test fixture was replaced by a calibrated attenuator.

  12. Relay protection features of frequency-adjustable electric drive

    NASA Astrophysics Data System (ADS)

    Kuprienko, V. V.

    2018-03-01

    The features of relay protection of high-voltage electric motors in composition of the frequency-adjustable electric drive are considered in the article. The influence of frequency converters on the stability of the operation of various types of relay protection used on electric motors is noted. Variants of circuits for connecting relay protection devices are suggested. The need to develop special relay protection devices for a frequency-adjustable electric drive is substantiated.

  13. 46 CFR 111.50-3 - Protection of conductors.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 46 Shipping 4 2013-10-01 2013-10-01 false Protection of conductors. 111.50-3 Section 111.50-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS... of overcurrent protection for conductors is to open the electric circuit if the current reaches a...

  14. 46 CFR 111.50-3 - Protection of conductors.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 46 Shipping 4 2014-10-01 2014-10-01 false Protection of conductors. 111.50-3 Section 111.50-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS... of overcurrent protection for conductors is to open the electric circuit if the current reaches a...

  15. 46 CFR 111.50-3 - Protection of conductors.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 46 Shipping 4 2012-10-01 2012-10-01 false Protection of conductors. 111.50-3 Section 111.50-3 Shipping COAST GUARD, DEPARTMENT OF HOMELAND SECURITY (CONTINUED) ELECTRICAL ENGINEERING ELECTRIC SYSTEMS... of overcurrent protection for conductors is to open the electric circuit if the current reaches a...

  16. Parallelizing quantum circuit synthesis

    NASA Astrophysics Data System (ADS)

    Di Matteo, Olivia; Mosca, Michele

    2016-03-01

    Quantum circuit synthesis is the process in which an arbitrary unitary operation is decomposed into a sequence of gates from a universal set, typically one which a quantum computer can implement both efficiently and fault-tolerantly. As physical implementations of quantum computers improve, the need is growing for tools that can effectively synthesize components of the circuits and algorithms they will run. Existing algorithms for exact, multi-qubit circuit synthesis scale exponentially in the number of qubits and circuit depth, leaving synthesis intractable for circuits on more than a handful of qubits. Even modest improvements in circuit synthesis procedures may lead to significant advances, pushing forward the boundaries of not only the size of solvable circuit synthesis problems, but also in what can be realized physically as a result of having more efficient circuits. We present a method for quantum circuit synthesis using deterministic walks. Also termed pseudorandom walks, these are walks in which once a starting point is chosen, its path is completely determined. We apply our method to construct a parallel framework for circuit synthesis, and implement one such version performing optimal T-count synthesis over the Clifford+T gate set. We use our software to present examples where parallelization offers a significant speedup on the runtime, as well as directly confirm that the 4-qubit 1-bit full adder has optimal T-count 7 and T-depth 3.

  17. Protective materials with real-time puncture detection capability

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Hermes, R.E.; Stampfer, J.F.; Valdez-Boyle, L.S.

    1996-08-01

    The protection of workers from chemical, biological, or radiological hazards requires the use of protective materials that can maintain their integrity during use. An accidental puncture in the protective material can result in a significant exposure to the worker. A five ply material has been developed that incorporates two layers of an electrically conductive polymer sandwiched between three layers of a nonconductive polymer. A normally open circuit that is connected between the conductive layers will be closed by puncturing the material with either a conductive or nonconductive object. This can be used to activate an audible alarm or visual beaconmore » to warn the worker of a breach in the integrity of the material. The worker is not connected to the circuit, and the puncture can be detected in real-time, even when caused by a nonconductor.« less

  18. Thermal protection system ablation sensor

    NASA Technical Reports Server (NTRS)

    Gorbunov, Sergey (Inventor); Martinez, Edward R. (Inventor); Scott, James B. (Inventor); Oishi, Tomomi (Inventor); Fu, Johnny (Inventor); Mach, Joseph G. (Inventor); Santos, Jose B. (Inventor)

    2011-01-01

    An isotherm sensor tracks space vehicle temperatures by a thermal protection system (TPS) material during vehicle re-entry as a function of time, and surface recession through calibration, calculation, analysis and exposed surface modeling. Sensor design includes: two resistive conductors, wound around a tube, with a first end of each conductor connected to a constant current source, and second ends electrically insulated from each other by a selected material that becomes an electrically conductive char at higher temperatures to thereby complete an electrical circuit. The sensor conductors become shorter as ablation proceeds and reduced resistance in the completed electrical circuit (proportional to conductor length) is continually monitored, using measured end-to-end voltage change or current in the circuit. Thermocouple and/or piezoelectric measurements provide consistency checks on local temperatures.

  19. Sequential circuit design for radiation hardened multiple voltage integrated circuits

    DOEpatents

    Clark, Lawrence T [Phoenix, AZ; McIver, III, John K.

    2009-11-24

    The present invention includes a radiation hardened sequential circuit, such as a bistable circuit, flip-flop or other suitable design that presents substantial immunity to ionizing radiation while simultaneously maintaining a low operating voltage. In one embodiment, the circuit includes a plurality of logic elements that operate on relatively low voltage, and a master and slave latches each having storage elements that operate on a relatively high voltage.

  20. Genetic circuit design automation.

    PubMed

    Nielsen, Alec A K; Der, Bryan S; Shin, Jonghyeon; Vaidyanathan, Prashant; Paralanov, Vanya; Strychalski, Elizabeth A; Ross, David; Densmore, Douglas; Voigt, Christopher A

    2016-04-01

    Computation can be performed in living cells by DNA-encoded circuits that process sensory information and control biological functions. Their construction is time-intensive, requiring manual part assembly and balancing of regulator expression. We describe a design environment, Cello, in which a user writes Verilog code that is automatically transformed into a DNA sequence. Algorithms build a circuit diagram, assign and connect gates, and simulate performance. Reliable circuit design requires the insulation of gates from genetic context, so that they function identically when used in different circuits. We used Cello to design 60 circuits forEscherichia coli(880,000 base pairs of DNA), for which each DNA sequence was built as predicted by the software with no additional tuning. Of these, 45 circuits performed correctly in every output state (up to 10 regulators and 55 parts), and across all circuits 92% of the output states functioned as predicted. Design automation simplifies the incorporation of genetic circuits into biotechnology projects that require decision-making, control, sensing, or spatial organization. Copyright © 2016, American Association for the Advancement of Science.

  1. Piezoelectric drive circuit

    DOEpatents

    Treu, Jr., Charles A.

    1999-08-31

    A piezoelectric motor drive circuit is provided which utilizes the piezoelectric elements as oscillators and a Meacham half-bridge approach to develop feedback from the motor ground circuit to produce a signal to drive amplifiers to power the motor. The circuit automatically compensates for shifts in harmonic frequency of the piezoelectric elements due to pressure and temperature changes.

  2. Magnetic field generated by lightning protection system

    NASA Astrophysics Data System (ADS)

    Geri, A.; Veca, G. M.

    1988-04-01

    A lightning protection system for today's civil buildings must be electromagnetically compatible with the electronic equipment present in the building. This paper highlights a mathematic model which analyzes the electromagnetic effects in the environment in which the lightning protection system is. This model is developed by means of finite elements of an electrical circuit where each element is represented by a double pole circuit according to the trapezoidal algorithm developed using the finite difference method. It is thus possible to analyze the electromagnetic phenomena associated with the transient effects created by the lightning stroke even for a high-intensity current. Referring to an elementary system comprised of an air terminal, a down conductor, and a ground terminal, numerical results are here laid out.

  3. GATING CIRCUITS

    DOEpatents

    Merrill, L.C.

    1958-10-14

    Control circuits for vacuum tubes are described, and a binary counter having an improved trigger circuit is reported. The salient feature of the binary counter is the application of the input signal to the cathode of each of two vacuum tubes through separate capacitors and the connection of each cathode to ground through separate diodes. The control of the binary counter is achieved in this manner without special pulse shaping of the input signal. A further advantage of the circuit is the simplicity and minimum nuruber of components required, making its use particularly desirable in computer machines.

  4. Flexible Circuits

    NASA Technical Reports Server (NTRS)

    1986-01-01

    Adflex Solutions, Inc.'s flexible circuits may be molded to the shape of a chassis for bulk reduction. Particularly valuable when circuitry must be moved. They are produced by combining a plastic film, a metallic conductor and an adhesive. One adhesive, LARC-TPI, developed by the Langley Research Center, is a thermoplastic polyimide resin used to produce laminates by Rogers Corporation. It can be processed at a lower temperature, has good moisture resistance and excellent adherence. It is used to bond film to copper foil conductor materials in flexible circuits. The circuits have both aerospace and commercial applications.

  5. Piezoelectric drive circuit

    DOEpatents

    Treu, C.A. Jr.

    1999-08-31

    A piezoelectric motor drive circuit is provided which utilizes the piezoelectric elements as oscillators and a Meacham half-bridge approach to develop feedback from the motor ground circuit to produce a signal to drive amplifiers to power the motor. The circuit automatically compensates for shifts in harmonic frequency of the piezoelectric elements due to pressure and temperature changes. 7 figs.

  6. Targeting circuits

    PubMed Central

    Rajasethupathy, Priyamvada; Ferenczi, Emily; Deisseroth, Karl

    2017-01-01

    Current optogenetic methodology enables precise inhibition or excitation of neural circuits, spanning timescales as needed from the acute (milliseconds) to the chronic (many days or more), for experimental modulation of network activity and animal behavior. Such broad temporal versatility, unique to optogenetic control, is particularly powerful when combined with brain activity measurements that span both acute and chronic timescales as well. This enables, for instance, the study of adaptive circuit dynamics across the intact brain, and tuning interventions to match activity patterns naturally observed during behavior in the same individual. Although the impact of this approach has been greater on basic research than on clinical translation, it is natural to ask if specific neural circuit activity patterns discovered to be involved in controlling adaptive or maladaptive behaviors could become targets for treatment of neuropsychiatric diseases. Here we consider the landscape of such ideas related to therapeutic targeting of circuit dynamics, taking note of developments not only in optical but also in ultrasonic, magnetic, and thermal methods. We note the recent emergence of first-in-kind optogenetically-guided clinical outcomes, as well as opportunities related to the integration of interventions and readouts spanning diverse circuit-physiology, molecular, and behavioral modalities. PMID:27104976

  7. [Shunt and short circuit].

    PubMed

    Rangel-Abundis, Alberto

    2006-01-01

    Shunt and short circuit are antonyms. In French, the term shunt has been adopted to denote the alternative pathway of blood flow. However, in French, as well as in Spanish, the word short circuit (court-circuit and cortocircuito) is synonymous with shunt, giving rise to a linguistic and scientific inconsistency. Scientific because shunt and short circuit made reference to a phenomenon that occurs in the field of the physics. Because shunt and short circuit are antonyms, it is necessary to clarify that shunt is an alternative pathway of flow from a net of high resistance to a net of low resistance, maintaining the stream. Short circuit is the interruption of the flow, because a high resistance impeaches the flood. This concept is applied to electrical and cardiovascular physiology, as well as to the metabolic pathways.

  8. Superconducting quantum circuits at the surface code threshold for fault tolerance.

    PubMed

    Barends, R; Kelly, J; Megrant, A; Veitia, A; Sank, D; Jeffrey, E; White, T C; Mutus, J; Fowler, A G; Campbell, B; Chen, Y; Chen, Z; Chiaro, B; Dunsworth, A; Neill, C; O'Malley, P; Roushan, P; Vainsencher, A; Wenner, J; Korotkov, A N; Cleland, A N; Martinis, John M

    2014-04-24

    A quantum computer can solve hard problems, such as prime factoring, database searching and quantum simulation, at the cost of needing to protect fragile quantum states from error. Quantum error correction provides this protection by distributing a logical state among many physical quantum bits (qubits) by means of quantum entanglement. Superconductivity is a useful phenomenon in this regard, because it allows the construction of large quantum circuits and is compatible with microfabrication. For superconducting qubits, the surface code approach to quantum computing is a natural choice for error correction, because it uses only nearest-neighbour coupling and rapidly cycled entangling gates. The gate fidelity requirements are modest: the per-step fidelity threshold is only about 99 per cent. Here we demonstrate a universal set of logic gates in a superconducting multi-qubit processor, achieving an average single-qubit gate fidelity of 99.92 per cent and a two-qubit gate fidelity of up to 99.4 per cent. This places Josephson quantum computing at the fault-tolerance threshold for surface code error correction. Our quantum processor is a first step towards the surface code, using five qubits arranged in a linear array with nearest-neighbour coupling. As a further demonstration, we construct a five-qubit Greenberger-Horne-Zeilinger state using the complete circuit and full set of gates. The results demonstrate that Josephson quantum computing is a high-fidelity technology, with a clear path to scaling up to large-scale, fault-tolerant quantum circuits.

  9. Macromodels of digital integrated circuits for program packages of circuit engineering design

    NASA Astrophysics Data System (ADS)

    Petrenko, A. I.; Sliusar, P. B.; Timchenko, A. P.

    1984-04-01

    Various aspects of the generation of macromodels of digital integrated circuits are examined, and their effective application in program packages of circuit engineering design is considered. Three levels of macromodels are identified, and the application of such models to the simulation of circuit outputs is discussed.

  10. 49 CFR 236.5 - Design of control circuits on closed circuit principle.

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... 49 Transportation 4 2014-10-01 2014-10-01 false Design of control circuits on closed circuit... THE INSTALLATION, INSPECTION, MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Rules and Instructions: All Systems General § 236.5 Design of control circuits on...

  11. 49 CFR 236.5 - Design of control circuits on closed circuit principle.

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... 49 Transportation 4 2011-10-01 2011-10-01 false Design of control circuits on closed circuit... THE INSTALLATION, INSPECTION, MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Rules and Instructions: All Systems General § 236.5 Design of control circuits on...

  12. 49 CFR 236.5 - Design of control circuits on closed circuit principle.

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... 49 Transportation 4 2012-10-01 2012-10-01 false Design of control circuits on closed circuit... THE INSTALLATION, INSPECTION, MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Rules and Instructions: All Systems General § 236.5 Design of control circuits on...

  13. 49 CFR 236.5 - Design of control circuits on closed circuit principle.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Design of control circuits on closed circuit... THE INSTALLATION, INSPECTION, MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Rules and Instructions: All Systems General § 236.5 Design of control circuits on...

  14. 49 CFR 236.5 - Design of control circuits on closed circuit principle.

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... 49 Transportation 4 2013-10-01 2013-10-01 false Design of control circuits on closed circuit... THE INSTALLATION, INSPECTION, MAINTENANCE, AND REPAIR OF SIGNAL AND TRAIN CONTROL SYSTEMS, DEVICES, AND APPLIANCES Rules and Instructions: All Systems General § 236.5 Design of control circuits on...

  15. Systems and methods for photovoltaic string protection

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Krein, Philip T.; Kim, Katherine A.; Pilawa-Podgurski, Robert C. N.

    A system and method includes a circuit for protecting a photovoltaic string. A bypass switch connects in parallel to the photovoltaic string and a hot spot protection switch connects in series with the photovoltaic string. A first control signal controls opening and closing of the bypass switch and a second control signal controls opening and closing of the hot spot protection switch. Upon detection of a hot spot condition the first control signal closes the bypass switch and after the bypass switch is closed the second control signal opens the hot spot protection switch.

  16. MULTIPLIER CIRCUIT

    DOEpatents

    Thomas, R.E.

    1959-01-20

    An electronic circuit is presented for automatically computing the product of two selected variables by multiplying the voltage pulses proportional to the variables. The multiplier circuit has a plurality of parallel resistors of predetermined values connected through separate gate circults between a first input and the output terminal. One voltage pulse is applied to thc flrst input while the second voltage pulse is applied to control circuitry for the respective gate circuits. Thc magnitude of the second voltage pulse selects the resistors upon which the first voltage pulse is imprcssed, whereby the resultant output voltage is proportional to the product of the input voltage pulses

  17. 30 CFR 77.704-10 - Tying into energized high-voltage surface circuits.

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... OF LABOR COAL MINE SAFETY AND HEALTH MANDATORY SAFETY STANDARDS, SURFACE COAL MINES AND SURFACE WORK.... If the work of forming an additional circuit by tying into an energized high-voltage surface line is performed from the ground, any person performing such work must wear and employ all of the protective...

  18. Digital circuits using universal logic gates

    NASA Technical Reports Server (NTRS)

    Whitaker, Sterling R. (Inventor); Miles, Lowell H. (Inventor); Cameron, Eric G. (Inventor); Donohoe, Gregory W. (Inventor); Gambles, Jody W. (Inventor)

    2004-01-01

    According to the invention, a digital circuit design embodied in at least one of a structural netlist, a behavioral netlist, a hardware description language netlist, a full-custom ASIC, a semi-custom ASIC, an IP core, an integrated circuit, a hybrid of chips, one or more masks, a FPGA, and a circuit card assembly is disclosed. The digital circuit design includes first and second sub-circuits. The first sub-circuits comprise a first percentage of the digital circuit design and the second sub-circuits comprise a second percentage of the digital circuit design. Each of the second sub-circuits is substantially comprised of one or more kernel circuits. The kernel circuits are comprised of selection circuits. The second percentage is at least 5%. In various embodiments, the second percentage could be at least 10%, 20%, 30%, 40%, 50%, 60%, 70%, 80%, 90%, or 95%.

  19. Remote reset circuit

    DOEpatents

    Gritzo, Russell E.

    1987-01-01

    A remote reset circuit acts as a stand-alone monitor and controller by clocking in each character sent by a terminal to a computer and comparing it to a given reference character. When a match occurs, the remote reset circuit activates the system's hardware reset line. The remote reset circuit is hardware based centered around monostable multivibrators and is unaffected by system crashes, partial serial transmissions, or power supply transients.

  20. Sensor readout detector circuit

    DOEpatents

    Chu, Dahlon D.; Thelen, Jr., Donald C.

    1998-01-01

    A sensor readout detector circuit is disclosed that is capable of detecting sensor signals down to a few nanoamperes or less in a high (microampere) background noise level. The circuit operates at a very low standby power level and is triggerable by a sensor event signal that is above a predetermined threshold level. A plurality of sensor readout detector circuits can be formed on a substrate as an integrated circuit (IC). These circuits can operate to process data from an array of sensors in parallel, with only data from active sensors being processed for digitization and analysis. This allows the IC to operate at a low power level with a high data throughput for the active sensors. The circuit may be used with many different types of sensors, including photodetectors, capacitance sensors, chemically-sensitive sensors or combinations thereof to provide a capability for recording transient events or for recording data for a predetermined period of time following an event trigger. The sensor readout detector circuit has applications for portable or satellite-based sensor systems.

  1. Sensor readout detector circuit

    DOEpatents

    Chu, D.D.; Thelen, D.C. Jr.

    1998-08-11

    A sensor readout detector circuit is disclosed that is capable of detecting sensor signals down to a few nanoamperes or less in a high (microampere) background noise level. The circuit operates at a very low standby power level and is triggerable by a sensor event signal that is above a predetermined threshold level. A plurality of sensor readout detector circuits can be formed on a substrate as an integrated circuit (IC). These circuits can operate to process data from an array of sensors in parallel, with only data from active sensors being processed for digitization and analysis. This allows the IC to operate at a low power level with a high data throughput for the active sensors. The circuit may be used with many different types of sensors, including photodetectors, capacitance sensors, chemically-sensitive sensors or combinations thereof to provide a capability for recording transient events or for recording data for a predetermined period of time following an event trigger. The sensor readout detector circuit has applications for portable or satellite-based sensor systems. 6 figs.

  2. Comparison of modified driver circuit and capacitor-transfer circuit in longitudinally excited N2 laser.

    PubMed

    Uno, Kazuyuki; Akitsu, Tetsuya; Nakamura, Kenshi; Jitsuno, Takahisa

    2013-04-01

    We developed a modified driver circuit composed of a capacitance and a spark gap, called a direct-drive circuit, for a longitudinally excited gas laser. The direct-drive circuit uses a large discharge impedance caused by a long discharge length of the longitudinal excitation scheme and eliminates the buffer capacitance used in the traditional capacitor-transfer circuit. We compared the direct-drive circuit and the capacitor-transfer circuit in a longitudinally excited N2 laser (wavelength: 337 nm). Producing high output energy with the capacitor-transfer circuit requires a large storage capacitance and a discharge tube with optimum dimensions (an inner diameter of 4 mm and a length of 10 cm in this work); in contrast, the direct-drive circuit requires a high breakdown voltage, achieved with a small storage capacitance and a large discharge tube. Additionally, for the same input energy of 792 mJ, the maximum output energy of the capacitor-transfer circuit was 174.2 μJ, and that of the direct-drive circuit was 344.7 μJ.

  3. Separating OR, SUM, and XOR Circuits.

    PubMed

    Find, Magnus; Göös, Mika; Järvisalo, Matti; Kaski, Petteri; Koivisto, Mikko; Korhonen, Janne H

    2016-08-01

    Given a boolean n × n matrix A we consider arithmetic circuits for computing the transformation x ↦ Ax over different semirings. Namely, we study three circuit models: monotone OR-circuits, monotone SUM-circuits (addition of non-negative integers), and non-monotone XOR-circuits (addition modulo 2). Our focus is on separating OR-circuits from the two other models in terms of circuit complexity: We show how to obtain matrices that admit OR-circuits of size O ( n ), but require SUM-circuits of size Ω( n 3/2 /log 2 n ).We consider the task of rewriting a given OR-circuit as a XOR-circuit and prove that any subquadratic-time algorithm for this task violates the strong exponential time hypothesis.

  4. CIRCUITS FOR CURRENT MEASUREMENTS

    DOEpatents

    Cox, R.J.

    1958-11-01

    Circuits are presented for measurement of a logarithmic scale of current flowing in a high impedance. In one form of the invention the disclosed circuit is in combination with an ionization chamber to measure lonization current. The particular circuit arrangement lncludes a vacuum tube having at least one grid, an ionization chamber connected in series with a high voltage source and the grid of the vacuum tube, and a d-c amplifier feedback circuit. As the ionization chamber current passes between the grid and cathode of the tube, the feedback circuit acts to stabilize the anode current, and the feedback voltage is a measure of the logaritbm of the ionization current.

  5. Method of determining the open circuit voltage of a battery in a closed circuit

    DOEpatents

    Brown, William E.

    1980-01-01

    The open circuit voltage of a battery which is connected in a closed circuit is determined without breaking the circuit or causing voltage upsets therein. The closed circuit voltage across the battery and the current flowing through it are determined under normal load and then a fractional change is made in the load and the new current and voltage values determined. The open circuit voltage is then calculated, according to known principles, from the two sets of values.

  6. Selective Manipulation of Neural Circuits.

    PubMed

    Park, Hong Geun; Carmel, Jason B

    2016-04-01

    Unraveling the complex network of neural circuits that form the nervous system demands tools that can manipulate specific circuits. The recent evolution of genetic tools to target neural circuits allows an unprecedented precision in elucidating their function. Here we describe two general approaches for achieving circuit specificity. The first uses the genetic identity of a cell, such as a transcription factor unique to a circuit, to drive expression of a molecule that can manipulate cell function. The second uses the spatial connectivity of a circuit to achieve specificity: one genetic element is introduced at the origin of a circuit and the other at its termination. When the two genetic elements combine within a neuron, they can alter its function. These two general approaches can be combined to allow manipulation of neurons with a specific genetic identity by introducing a regulatory gene into the origin or termination of the circuit. We consider the advantages and disadvantages of both these general approaches with regard to specificity and efficacy of the manipulations. We also review the genetic techniques that allow gain- and loss-of-function within specific neural circuits. These approaches introduce light-sensitive channels (optogenetic) or drug sensitive channels (chemogenetic) into neurons that form specific circuits. We compare these tools with others developed for circuit-specific manipulation and describe the advantages of each. Finally, we discuss how these tools might be applied for identification of the neural circuits that mediate behavior and for repair of neural connections.

  7. Remote reset circuit

    DOEpatents

    Gritzo, R.E.

    1985-09-12

    A remote reset circuit acts as a stand-along monitor and controller by clocking in each character sent by a terminal to a computer and comparing it to a given reference character. When a match occurs, the remote reset circuit activates the system's hardware reset line. The remote reset circuit is hardware based centered around monostable multivibrators and is unaffected by system crashes, partial serial transmissions, or power supply transients. 4 figs.

  8. A Circuit to Demonstrate Phase Relationships in "RLC" Circuits

    ERIC Educational Resources Information Center

    Sokol, P. E.; Warren, G.; Zheng, B.; Smith, P.

    2013-01-01

    We have developed a circuit to demonstrate the phase relationships between resistive and reactive elements in series "RLC" circuits. We utilize a differential amplifier to allow the phases of the three elements and the current to be simultaneously displayed on an inexpensive four channel oscilloscope. We have included a novel circuit…

  9. Polymorphic Electronic Circuits

    NASA Technical Reports Server (NTRS)

    Stoica, Adrian

    2004-01-01

    Polymorphic electronics is a nascent technological discipline that involves, among other things, designing the same circuit to perform different analog and/or digital functions under different conditions. For example, a circuit can be designed to function as an OR gate or an AND gate, depending on the temperature (see figure). Polymorphic electronics can also be considered a subset of polytronics, which is a broader technological discipline in which optical and possibly other information- processing systems could also be designed to perform multiple functions. Polytronics is an outgrowth of evolvable hardware (EHW). The basic concepts and some specific implementations of EHW were described in a number of previous NASA Tech Briefs articles. To recapitulate: The essence of EHW is to design, construct, and test a sequence of populations of circuits that function as incrementally better solutions of a given design problem through the selective, repetitive connection and/or disconnection of capacitors, transistors, amplifiers, inverters, and/or other circuit building blocks. The evolution is guided by a search-and-optimization algorithm (in particular, a genetic algorithm) that operates in the space of possible circuits to find a circuit that exhibits an acceptably close approximation of the desired functionality. The evolved circuits can be tested by computational simulation (in which case the evolution is said to be extrinsic), tested in real hardware (in which case the evolution is said to be intrinsic), or tested in random sequences of computational simulation and real hardware (in which case the evolution is said to be mixtrinsic).

  10. Method and Circuit for Injecting a Precise Amount of Charge onto a Circuit Node

    NASA Technical Reports Server (NTRS)

    Hancock, Bruce R. (Inventor)

    2016-01-01

    A method and circuit for injecting charge into a circuit node, comprising (a) resetting a capacitor's voltage through a first transistor; (b) after the resetting, pre-charging the capacitor through the first transistor; and (c) after the pre-charging, further charging the capacitor through a second transistor, wherein the second transistor is connected between the capacitor and a circuit node, and the further charging draws charge through the second transistor from the circuit node, thereby injecting charge into the circuit node.

  11. Modulation of short-term plasticity in the corticothalamic circuit by group III metabotropic glutamate receptors.

    PubMed

    Kyuyoung, Christine L; Huguenard, John R

    2014-01-08

    Recurrent connections in the corticothalamic circuit underlie oscillatory behavior in this network and range from normal sleep rhythms to the abnormal spike-wave discharges seen in absence epilepsy. The propensity of thalamic neurons to fire postinhibitory rebound bursts mediated by low-threshold calcium spikes renders the circuit vulnerable to both increased excitation and increased inhibition, such as excessive excitatory cortical drive to thalamic reticular (RT) neurons or heightened inhibition of thalamocortical relay (TC) neurons by RT. In this context, a protective role may be played by group III metabotropic receptors (mGluRs), which are uniquely located in the presynaptic active zone and typically act as autoreceptors or heteroceptors to depress synaptic release. Here, we report that these receptors regulate short-term plasticity at two loci in the corticothalamic circuit in rats: glutamatergic cortical synapses onto RT neurons and GABAergic synapses onto TC neurons in somatosensory ventrobasal thalamus. The net effect of group III mGluR activation at these synapses is to suppress thalamic oscillations as assayed in vitro. These findings suggest a functional role of these receptors to modulate corticothalamic transmission and protect against prolonged activity in the network.

  12. Multi-Layer E-Textile Circuits

    NASA Technical Reports Server (NTRS)

    Dunne, Lucy E.; Bibeau, Kaila; Mulligan, Lucie; Frith, Ashton; Simon, Cory

    2012-01-01

    Stitched e-textile circuits facilitate wearable, flexible, comfortable wearable technology. However, while stitched methods of e-textile circuits are common, multi-layer circuit creation remains a challenge. Here, we present methods of stitched multi-layer circuit creation using accessible tools and techniques.

  13. Automatic circuit interrupter

    NASA Technical Reports Server (NTRS)

    Dwinell, W. S.

    1979-01-01

    In technique, voice circuits connecting crew's cabin to launch station through umbilical connector disconnect automatically unused, or deadened portion of circuits immediately after vehicle is launched, eliminating possibility that unused wiring interferes with voice communications inside vehicle or need for manual cutoff switch and its associated wiring. Technique is applied to other types of electrical actuation circuits, also launch of mapped vehicles, such as balloons, submarines, test sleds, and test chambers-all requiring assistance of ground crew.

  14. The Implications of the Use of Parental Choice as a Legal "Circuit Breaker"

    ERIC Educational Resources Information Center

    Mead, Julie F.; Lewis, Maria M.

    2016-01-01

    This study explores four instances where parental choice has been employed as a legal "circuit breaker": (a) First Amendment Establishment Clause cases related to public funding, (b) Fourteenth Amendment Equal Protection cases regarding race-conscious student assignment, (c) Title IX regulations concerning single-sex education, and (d) a…

  15. Exchange circuits for FASTBUS slaves

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Bratskii, A.A.; Matseev, M.Y.; Rybakov, V.G.

    1985-09-01

    This paper describes general-purpose circuits for FASTBUS interfacing of the functional part of a slave device. The circuits contain buffered receivers and transmitters, addressrecognition and data-transfer logic, and the required control/status registers. The described circuits are implemented with series-K500 integrated circuits.

  16. ELECTRICAL PROTECTIVE DEVICE

    DOEpatents

    Baker, W.R.

    1958-05-01

    A protective system for high-energy resonant cavities is described. It is particularly directed to the discharging of resonant cavities for preventing energy back flow through associated equipment as a result of faults. The invention in general provides means defining a spark gap communicating with the interior of a cavity or waveguide adapted for high-power energization or an evacuated chamber containing an electrode having a large power differential from the wall or other electrode. A control or trigger circuit is connected between a power supply energizing the cavity and the spark gap whereby reverse current flow in the power supply circuit instantaneously triggers the spark gap to initiate discharge within the cavity, whereupon cavity energy discharges across the gap, or with an electrode present the electrode discharges to one of the spark gap elements.

  17. Superconducting flux flow digital circuits

    DOEpatents

    Hietala, Vincent M.; Martens, Jon S.; Zipperian, Thomas E.

    1995-01-01

    A NOR/inverter logic gate circuit and a flip flop circuit implemented with superconducting flux flow transistors (SFFTs). Both circuits comprise two SFFTs with feedback lines. They have extremely low power dissipation, very high switching speeds, and the ability to interface between Josephson junction superconductor circuits and conventional microelectronics.

  18. Digital MOS integrated circuits

    NASA Astrophysics Data System (ADS)

    Elmasry, M. I.

    MOS in digital circuit design is considered along with aspects of digital VLSI, taking into account a comparison of MOSFET logic circuits, 1-micrometer MOSFET VLSI technology, a generalized guide for MOSFET miniaturization, processing technologies, novel circuit structures for VLSI, and questions of circuit and system design for VLSI. MOS memory cells and circuits are discussed, giving attention to a survey of high-density dynamic RAM cell concepts, one-device cells for dynamic random-access memories, variable resistance polysilicon for high density CMOS Ram, high performance MOS EPROMs using a stacked-gate cell, and the optimization of the latching pulse for dynamic flip-flop sensors. Programmable logic arrays are considered along with digital signal processors, microprocessors, static RAMs, and dynamic RAMs.

  19. Superconducting quantum circuits theory and application

    NASA Astrophysics Data System (ADS)

    Deng, Xiuhao

    Superconducting quantum circuit models are widely used to understand superconducting devices. This thesis consists of four studies wherein the superconducting quantum circuit is used to illustrate challenges related to quantum information encoding and processing, quantum simulation, quantum signal detection and amplification. The existence of scalar Aharanov-Bohm phase has been a controversial topic for decades. Scalar AB phase, defined as time integral of electric potential, gives rises to an extra phase factor in wavefunction. We proposed a superconducting quantum Faraday cage to detect temporal interference effect as a consequence of scalar AB phase. Using the superconducting quantum circuit model, the physical system is solved and resulting AB effect is predicted. Further discussion in this chapter shows that treating the experimental apparatus quantum mechanically, spatial scalar AB effect, proposed by Aharanov-Bohm, can't be observed. Either a decoherent interference apparatus is used to observe spatial scalar AB effect, or a quantum Faraday cage is used to observe temporal scalar AB effect. The second study involves protecting a quantum system from losing coherence, which is crucial to any practical quantum computation scheme. We present a theory to encode any qubit, especially superconducting qubits, into a universal quantum degeneracy point (UQDP) where low frequency noise is suppressed significantly. Numerical simulations for superconducting charge qubit using experimental parameters show that its coherence time is prolong by two orders of magnitude using our universal degeneracy point approach. With this improvement, a set of universal quantum gates can be performed at high fidelity without losing too much quantum coherence. Starting in 2004, the use of circuit QED has enabled the manipulation of superconducting qubits with photons. We applied quantum optical approach to model coupled resonators and obtained a four-wave mixing toolbox to operate photons

  20. The test of VLSI circuits

    NASA Astrophysics Data System (ADS)

    Baviere, Ph.

    Tests which have proven effective for evaluating VLSI circuits for space applications are described. It is recommended that circuits be examined after each manfacturing step to gain fast feedback on inadequacies in the production system. Data from failure modes which occur during operational lifetimes of circuits also permit redefinition of the manufacturing and quality control process to eliminate the defects identified. Other tests include determination of the operational envelope of the circuits, examination of the circuit response to controlled inputs, and the performance and functional speeds of ROM and RAM memories. Finally, it is desirable that all new circuits be designed with testing in mind.

  1. 49 CFR 236.787 - Protection, cross.

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... 49 Transportation 4 2010-10-01 2010-10-01 false Protection, cross. 236.787 Section 236.787 Transportation Other Regulations Relating to Transportation (Continued) FEDERAL RAILROAD ADMINISTRATION..., or derail as the result of a cross in electrical circuits. Cross Reference: Ramp, see § 236.744. ...

  2. PRECISION TIME-DELAY CIRCUIT

    DOEpatents

    Creveling, R.

    1959-03-17

    A tine-delay circuit which produces a delay time in d. The circuit a capacitor, an te back resistance, connected serially with the anode of the diode going to ground. At the start of the time delay a negative stepfunction is applied to the series circuit and initiates a half-cycle transient oscillatory voltage terminated by a transient oscillatory voltage of substantially higher frequency. The output of the delay circuit is taken at the junction of the inductor and diode where a sudden voltage rise appears after the initiation of the higher frequency transient oscillations.

  3. Superconducting flux flow digital circuits

    DOEpatents

    Hietala, V.M.; Martens, J.S.; Zipperian, T.E.

    1995-02-14

    A NOR/inverter logic gate circuit and a flip flop circuit implemented with superconducting flux flow transistors (SFFTs) are disclosed. Both circuits comprise two SFFTs with feedback lines. They have extremely low power dissipation, very high switching speeds, and the ability to interface between Josephson junction superconductor circuits and conventional microelectronics. 8 figs.

  4. Auto-programmable impulse neural circuits

    NASA Technical Reports Server (NTRS)

    Watula, D.; Meador, J.

    1990-01-01

    Impulse neural networks use pulse trains to communicate neuron activation levels. Impulse neural circuits emulate natural neurons at a more detailed level than that typically employed by contemporary neural network implementation methods. An impulse neural circuit which realizes short term memory dynamics is presented. The operation of that circuit is then characterized in terms of pulse frequency modulated signals. Both fixed and programmable synapse circuits for realizing long term memory are also described. The implementation of a simple and useful unsupervised learning law is then presented. The implementation of a differential Hebbian learning rule for a specific mean-frequency signal interpretation is shown to have a straightforward implementation using digital combinational logic with a variation of a previously developed programmable synapse circuit. This circuit is expected to be exploited for simple and straightforward implementation of future auto-adaptive neural circuits.

  5. Physical mechanisms for reduction of the breakdown voltage in the circuit of a rod lightning protector with an opening microswitch

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Bobrov, Yu. K.; Zhuravkov, I. V.; Ostapenko, E. I.

    2010-12-15

    The effect of air gap breakdown voltage reduction in the circuit with an opening microswitch is substantiated from the physical point of view. This effect can be used to increase the efficiency of lightning protection system with a rod lightning protector. The processes which take place in the electric circuit of a lightning protector with a microswitch during a voltage breakdown are investigated. Openings of the microswitch are shown to lead to resonance overvoltages in the dc circuit and, as a result, efficient reduction in the breakdown voltage in a lightning protector-thundercloud air gap.

  6. Protected Quantum Computation with Multiple Resonators in Ultrastrong Coupling Circuit QED

    NASA Astrophysics Data System (ADS)

    Nataf, Pierre; Ciuti, Cristiano

    2011-11-01

    We investigate theoretically the dynamical behavior of a qubit obtained with the two ground eigenstates of an ultrastrong coupling circuit-QED system consisting of a finite number of Josephson fluxonium atoms inductively coupled to a transmission line resonator. We show a universal set of quantum gates by using multiple transmission line resonators (each resonator represents a single qubit). We discuss the intrinsic “anisotropic” nature of noise sources for fluxonium artificial atoms. Through a master equation treatment with colored noise and many-level dynamics, we prove that, for a general class of anisotropic noise sources, the coherence time of the qubit and the fidelity of the quantum operations can be dramatically improved in an optimal regime of ultrastrong coupling, where the ground state is an entangled photonic “cat” state.

  7. Electronic Circuit Analysis Language (ECAL)

    NASA Astrophysics Data System (ADS)

    Chenghang, C.

    1983-03-01

    The computer aided design technique is an important development in computer applications and it is an important component of computer science. The special language for electronic circuit analysis is the foundation of computer aided design or computer aided circuit analysis (abbreviated as CACD and CACA) of simulated circuits. Electronic circuit analysis language (ECAL) is a comparatively simple and easy to use circuit analysis special language which uses the FORTRAN language to carry out the explanatory executions. It is capable of conducting dc analysis, ac analysis, and transient analysis of a circuit. Futhermore, the results of the dc analysis can be used directly as the initial conditions for the ac and transient analyses.

  8. Diode-quad bridge circuit means

    NASA Technical Reports Server (NTRS)

    Harrison, D. R.; Dimeff, J. (Inventor)

    1975-01-01

    Diode-quad bridge circuit means is described for use as a transducer circuit or as a discriminator circuit. It includes: (1) a diode bridge having first, second, third, and fourth bridge terminals consecutively coupled together by four diodes polarized in circulating relationship; (2) a first impedance connected between the second bridge terminal and a circuit ground; (3) a second impedance connected between the fourth bridge terminal and the circuit ground; (4) a signal source having a first source terminal capacitively coupled to the first and third bridge terminals, and a second source terminal connected to the circuit ground; and (5) an output terminal coupled to the first bridge terminal and at which an output signal may be taken.

  9. Charge regulation circuit

    DOEpatents

    Ball, Don G.

    1992-01-01

    A charge regulation circuit provides regulation of an unregulated voltage supply in the range of 0.01%. The charge regulation circuit is utilized in a preferred embodiment in providing regulated voltage for controlling the operation of a laser.

  10. An Electronics Course Emphasizing Circuit Design

    ERIC Educational Resources Information Center

    Bergeson, Haven E.

    1975-01-01

    Describes a one-quarter introductory electronics course in which the students use a variety of inexpensive integrated circuits to design and construct a large number of useful circuits. Presents the subject matter of the course in three parts: linear circuits, digital circuits, and more complex circuits. (GS)

  11. Electrical Circuits and Water Analogies

    ERIC Educational Resources Information Center

    Smith, Frederick A.; Wilson, Jerry D.

    1974-01-01

    Briefly describes water analogies for electrical circuits and presents plans for the construction of apparatus to demonstrate these analogies. Demonstrations include series circuits, parallel circuits, and capacitors. (GS)

  12. Soldering Tool for Integrated Circuits

    NASA Technical Reports Server (NTRS)

    Takahashi, Ted H.

    1987-01-01

    Many connections soldered simultaneously in confined spaces. Improved soldering tool bonds integrated circuits onto printed-circuit boards. Intended especially for use with so-called "leadless-carrier" integrated circuits.

  13. Ladder-Type Circuits Revisited

    ERIC Educational Resources Information Center

    Yoon, Sung Hyun

    2007-01-01

    Ladder-type circuits where a given unit is repeated infinitely many times are dealt with in many textbooks on electromagnetism as examples of filter circuits. Determining the impedance of such circuits seems to be regarded as simple, which may be due to the fact that the invariance of the infinite system under the operation of adding one more unit…

  14. Maximum Acceleration Recording Circuit

    NASA Technical Reports Server (NTRS)

    Bozeman, Richard J., Jr.

    1995-01-01

    Coarsely digitized maximum levels recorded in blown fuses. Circuit feeds power to accelerometer and makes nonvolatile record of maximum level to which output of accelerometer rises during measurement interval. In comparison with inertia-type single-preset-trip-point mechanical maximum-acceleration-recording devices, circuit weighs less, occupies less space, and records accelerations within narrower bands of uncertainty. In comparison with prior electronic data-acquisition systems designed for same purpose, circuit simpler, less bulky, consumes less power, costs and analysis of data recorded in magnetic or electronic memory devices. Circuit used, for example, to record accelerations to which commodities subjected during transportation on trucks.

  15. Four-junction superconducting circuit

    PubMed Central

    Qiu, Yueyin; Xiong, Wei; He, Xiao-Ling; Li, Tie-Fu; You, J. Q.

    2016-01-01

    We develop a theory for the quantum circuit consisting of a superconducting loop interrupted by four Josephson junctions and pierced by a magnetic flux (either static or time-dependent). In addition to the similarity with the typical three-junction flux qubit in the double-well regime, we demonstrate the difference of the four-junction circuit from its three-junction analogue, including its advantages over the latter. Moreover, the four-junction circuit in the single-well regime is also investigated. Our theory provides a tool to explore the physical properties of this four-junction superconducting circuit. PMID:27356619

  16. Solid state remote circuit selector switch

    NASA Technical Reports Server (NTRS)

    Peterson, V. S.

    1970-01-01

    Remote switching circuit utilizes voltage logic to switch on desired circuit. Circuit controls rotating multi-range pressure transducers in jet engine testing and can be used in coded remote circuit activator where sequence of switching has to occur in defined length of time to prevent false or undesired circuit activation.

  17. Vibration Damping Circuit Card Assembly

    NASA Technical Reports Server (NTRS)

    Hunt, Ronald Allen (Inventor)

    2016-01-01

    A vibration damping circuit card assembly includes a populated circuit card having a mass M. A closed metal container is coupled to a surface of the populated circuit card at approximately a geometric center of the populated circuit card. Tungsten balls fill approximately 90% of the metal container with a collective mass of the tungsten balls being approximately (0.07) M.

  18. Determining localized anode condition to maintain effective corrosion protection.

    DOT National Transportation Integrated Search

    2010-01-01

    Thermal sprayed zinc anodes used for impressed current cathodic protection of reinforced concrete deteriorate over time. : Two different technologies, ultrasound and electrical circuit resistance combined with water permeability, were : investigated ...

  19. 30 CFR 75.900 - Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit...

    Code of Federal Regulations, 2011 CFR

    2011-07-01

    ...-phase alternating current equipment; circuit breakers. 75.900 Section 75.900 Mineral Resources MINE... Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit breakers. [Statutory Provisions] Low- and medium-voltage power circuits serving three-phase alternating current...

  20. TRIPPING CIRCUIT

    DOEpatents

    Lees, G.W.; McCormick, E.D.

    1962-05-22

    A tripping circuit employing a magnetic amplifier for tripping a reactor in response to power level, period, or instrument failure is described. A reference winding and signal winding are wound in opposite directions on the core. Current from an ion chamber passes through both windings. If the current increases at too fast a rate, a shunt circuit bypasses one or the windings and the amplifier output reverses polarity. (AEC)

  1. Integrated coherent matter wave circuits

    DOE PAGES

    Ryu, C.; Boshier, M. G.

    2015-09-21

    An integrated coherent matter wave circuit is a single device, analogous to an integrated optical circuit, in which coherent de Broglie waves are created and then launched into waveguides where they can be switched, divided, recombined, and detected as they propagate. Applications of such circuits include guided atom interferometers, atomtronic circuits, and precisely controlled delivery of atoms. We report experiments demonstrating integrated circuits for guided coherent matter waves. The circuit elements are created with the painted potential technique, a form of time-averaged optical dipole potential in which a rapidly moving, tightly focused laser beam exerts forces on atoms through theirmore » electric polarizability. Moreover, the source of coherent matter waves is a Bose–Einstein condensate (BEC). Finally, we launch BECs into painted waveguides that guide them around bends and form switches, phase coherent beamsplitters, and closed circuits. These are the basic elements that are needed to engineer arbitrarily complex matter wave circuitry.« less

  2. Liquid detection circuit

    DOEpatents

    Regan, Thomas O.

    1987-01-01

    Herein is a circuit which is capable of detecting the presence of liquids, especially cryogenic liquids, and whose sensor will not overheat in a vacuum. The circuit parameters, however, can be adjusted to work with any liquid over a wide range of temperatures.

  3. Amplifier improvement circuit

    NASA Technical Reports Server (NTRS)

    Sturman, J.

    1968-01-01

    Stable input stage was designed for the use with a integrated circuit operational amplifier to provide improved performance as an instrumentation-type amplifier. The circuit provides high input impedance, stable gain, good common mode rejection, very low drift, and low output impedance.

  4. 30 CFR 75.900 - Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit...

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Low- and medium-voltage circuits serving three... STANDARDS-UNDERGROUND COAL MINES Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900 Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit breakers...

  5. 30 CFR 75.900 - Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit...

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Low- and medium-voltage circuits serving three... STANDARDS-UNDERGROUND COAL MINES Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900 Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit breakers...

  6. 30 CFR 75.900 - Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit...

    Code of Federal Regulations, 2010 CFR

    2010-07-01

    ... 30 Mineral Resources 1 2010-07-01 2010-07-01 false Low- and medium-voltage circuits serving three... STANDARDS-UNDERGROUND COAL MINES Underground Low- and Medium-Voltage Alternating Current Circuits § 75.900 Low- and medium-voltage circuits serving three-phase alternating current equipment; circuit breakers...

  7. Reconfigurable Optical Directed-Logic Circuits

    DTIC Science & Technology

    2015-11-20

    AFRL-AFOSR-VA-TR-2016-0053 Reconfigurable Optical Directed-Logic Circuits Jacob Robinson WILLIAM MARSH RICE UNIV HOUSTON TX Final Report 11/20/2015...2015 Reconfigurable Optical Directed-Logic Circuits FA9550-12-1-0261 FA9550-12-1-0261 Robinson, Jacob Rice University 6100 Main Street Houston...Optical Directed-Logic Circuits Jacob T. Robinson and Qianfan Xu Rice University 1. Motivation for Directed-Logic Circuits Directed-logic is

  8. 78 FR 37203 - Authorization of Production Activity; Subzone 196A; TTI, Inc. (Electromechanical and Circuit...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2013-06-20

    ... DEPARTMENT OF COMMERCE Foreign-Trade Zones Board [B-20-2013] Authorization of Production Activity; Subzone 196A; TTI, Inc. (Electromechanical and Circuit Protection Devices Production/Kitting); Fort Worth, Texas On February 13, 2013, TTI, Inc. submitted a notification of proposed production activity to the...

  9. Superfund explanation of significant difference for the Record of Decision (EPA Region 10): United Heckathorn Company, Richmond, CA, November 29, 1996

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    NONE

    The United States Environmental Protection Agency (EPA) is issuing this explanation of significant differences (ESD) for the United Heckathorn Superfund Site located in Richmond, California (the Site). The US National Oceanic and Atmospheric Administration (NOAA), recommended that the dredging of the Lauritzen Channel and Parr Canal not be conducted during the period from December 1 to March 1 in order to protect the herring spawning season in San Francisco Bay. By this ESD, EPA is now authorizing and allowing marine response actions, including dredging and related activities, in the Lauritzen Channel and Parr Canal, to be conducted on and aftermore » December 1.« less

  10. Rewiring the severe acute respiratory syndrome coronavirus (SARS-CoV) transcription circuit: Engineering a recombination-resistant genome

    NASA Astrophysics Data System (ADS)

    Yount, Boyd; Roberts, Rhonda S.; Lindesmith, Lisa; Baric, Ralph S.

    2006-08-01

    Live virus vaccines provide significant protection against many detrimental human and animal diseases, but reversion to virulence by mutation and recombination has reduced appeal. Using severe acute respiratory syndrome coronavirus as a model, we engineered a different transcription regulatory circuit and isolated recombinant viruses. The transcription network allowed for efficient expression of the viral transcripts and proteins, and the recombinant viruses replicated to WT levels. Recombinant genomes were then constructed that contained mixtures of the WT and mutant regulatory circuits, reflecting recombinant viruses that might occur in nature. Although viable viruses could readily be isolated from WT and recombinant genomes containing homogeneous transcription circuits, chimeras that contained mixed regulatory networks were invariantly lethal, because viable chimeric viruses were not isolated. Mechanistically, mixed regulatory circuits promoted inefficient subgenomic transcription from inappropriate start sites, resulting in truncated ORFs and effectively minimize viral structural protein expression. Engineering regulatory transcription circuits of intercommunicating alleles successfully introduces genetic traps into a viral genome that are lethal in RNA recombinant progeny viruses. regulation | systems biology | vaccine design

  11. Submicrosecond Power-Switching Test Circuit

    NASA Technical Reports Server (NTRS)

    Folk, Eric N.

    2006-01-01

    A circuit that changes an electrical load in a switching time shorter than 0.3 microsecond has been devised. This circuit can be used in testing the regulation characteristics of power-supply circuits . especially switching power-converter circuits that are supposed to be able to provide acceptably high degrees of regulation in response to rapid load transients. The combination of this power-switching circuit and a known passive constant load could be an attractive alternative to a typical commercially available load-bank circuit that can be made to operate in nominal constant-voltage, constant-current, and constant-resistance modes. The switching provided by a typical commercial load-bank circuit in the constant-resistance mode is not fast enough for testing of regulation in response to load transients. Moreover, some test engineers do not trust the test results obtained when using commercial load-bank circuits because the dynamic responses of those circuits are, variously, partly unknown and/or excessively complex. In contrast, the combination of this circuit and a passive constant load offers both rapid switching and known (or at least better known) load dynamics. The power-switching circuit (see figure) includes a signal-input section, a wide-hysteresis Schmitt trigger that prevents false triggering in the event of switch-contact bounce, a dual-bipolar-transistor power stage that drives the gate of a metal oxide semiconductor field-effect transistor (MOSFET), and the MOSFET, which is the output device that performs the switching of the load. The MOSFET in the specific version of the circuit shown in the figure is rated to stand off a potential of 100 V in the "off" state and to pass a current of 20 A in the "on" state. The switching time of this circuit (the characteristic time of rise or fall of the potential at the drain of the MOSFET) is .300 ns. The circuit can accept any of three control inputs . which one depending on the test that one seeks to perform: a

  12. A proposed holistic approach to on-chip, off-chip, test, and package interconnections

    NASA Astrophysics Data System (ADS)

    Bartelink, Dirk J.

    1998-11-01

    The term interconnection has traditionally implied a `robust' connection from a transistor or a group of transistors in an IC to the outside world, usually a PC board. Optimum system utilization is done from outside the IC. As an alternative, this paper addresses `unimpeded' transistor-to-transistor interconnection aimed at reaching the high circuit densities and computational capabilities of neighboring IC's. In this view, interconnections are not made to some human-centric place outside the IC world requiring robustness—except for system input and output connections. This unimpeded interconnect style is currently available only through intra-chip signal traces in `system-on-a-chip' implementations, as exemplified by embedded DRAMs. Because the traditional off-chip penalty in performance and wiring density is so large, a merging of complex process technologies is the only option today. It is suggested that, for system integration to move forward, the traditional robustness requirement inherited from conventional packaging interconnect and IC manufacturing test must be discarded. Traditional system assembly from vendor parts requires robustness under shipping, inspection and assembly. The trend toward systems on a chip signifies willingness by semiconductor companies to design and fabricate whole systems in house, so that `in-house' chip-to-chip assembly is not beyond reach. In this scenario, bare chips never leave the controlled environment of the IC fabricator while the two major contributors to off-chip signal penalty, ESD protection and the need to source a 50-ohm test head, are avoided. With in-house assembly, ESD protection can be eliminated with the precautions already familiar in plasma etching. Test interconnection impacts the fundamentals of IC manufacturing, particularly with clock speeds approaching 1GHz, and cannot be an afterthought. It should be an integral part of the chip-to-chip interconnection bandwidth optimization, because—as we must

  13. Methods of fabricating applique circuits

    DOEpatents

    Dimos, Duane B.; Garino, Terry J.

    1999-09-14

    Applique circuits suitable for advanced packaging applications are introduced. These structures are particularly suited for the simple integration of large amounts (many nanoFarads) of capacitance into conventional integrated circuit and multichip packaging technology. In operation, applique circuits are bonded to the integrated circuit or other appropriate structure at the point where the capacitance is required, thereby minimizing the effects of parasitic coupling. An immediate application is to problems of noise reduction and control in modern high-frequency circuitry.

  14. Integrated circuit cooled turbine blade

    DOE Office of Scientific and Technical Information (OSTI.GOV)

    Lee, Ching-Pang; Jiang, Nan; Um, Jae Y.

    A turbine rotor blade includes at least two integrated cooling circuits that are formed within the blade that include a leading edge circuit having a first cavity and a second cavity and a trailing edge circuit that includes at least a third cavity located aft of the second cavity. The trailing edge circuit flows aft with at least two substantially 180-degree turns at the tip end and the root end of the blade providing at least a penultimate cavity and a last cavity. The last cavity is located along a trailing edge of the blade. A tip axial cooling channelmore » connects to the first cavity of the leading edge circuit and the penultimate cavity of the trailing edge circuit. At least one crossover hole connects the penultimate cavity to the last cavity substantially near the tip end of the blade.« less

  15. Automated Design of Quantum Circuits

    NASA Technical Reports Server (NTRS)

    Williams, Colin P.; Gray, Alexander G.

    2000-01-01

    In order to design a quantum circuit that performs a desired quantum computation, it is necessary to find a decomposition of the unitary matrix that represents that computation in terms of a sequence of quantum gate operations. To date, such designs have either been found by hand or by exhaustive enumeration of all possible circuit topologies. In this paper we propose an automated approach to quantum circuit design using search heuristics based on principles abstracted from evolutionary genetics, i.e. using a genetic programming algorithm adapted specially for this problem. We demonstrate the method on the task of discovering quantum circuit designs for quantum teleportation. We show that to find a given known circuit design (one which was hand-crafted by a human), the method considers roughly an order of magnitude fewer designs than naive enumeration. In addition, the method finds novel circuit designs superior to those previously known.

  16. Digital model of a vacuum circuit breaker for the analysis of switching waveforms in electrical circuits

    NASA Astrophysics Data System (ADS)

    Budzisz, Joanna; Wróblewski, Zbigniew

    2016-03-01

    The article presents a method of modelling a vaccum circuit breaker in the ATP/EMTP package, the results of the verification of the correctness of the developed digital circuit breaker model operation and its practical usefulness for analysis of overvoltages and overcurrents occurring in commutated capacitive electrical circuits and also examples of digital simulations of overvoltages and overcurrents in selected electrical circuits.

  17. The ac power line protection for an IEEE 587 Class B environment

    NASA Technical Reports Server (NTRS)

    Roehr, W. D.; Clark, O. M.

    1984-01-01

    The 587B series of protectors are unique, low clamping voltage transient suppressors to protect ac-powered equipment from the 6000V peak open-circuit voltage and 3000A short circuit current as defined in IEEE standard 587 for Category B transients. The devices, which incorporate multiple-stage solid-state protector components, were specifically designed to operate under multiple exposures to maximum threat levels in this severe environment. The output voltage peaks are limited to 350V under maximum threat conditions for a 120V ac power line, thus providing adequate protection to vulnerable electronic equipment. The principle of operation and test performance data is discussed.

  18. 49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

    Code of Federal Regulations, 2010 CFR

    2010-10-01

    ... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

  19. 49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

    Code of Federal Regulations, 2012 CFR

    2012-10-01

    ... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

  20. 49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

    Code of Federal Regulations, 2013 CFR

    2013-10-01

    ... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

  1. 49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

    Code of Federal Regulations, 2014 CFR

    2014-10-01

    ... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

  2. 49 CFR 236.303 - Control circuits for signals, selection through circuit controller operated by switch points or...

    Code of Federal Regulations, 2011 CFR

    2011-10-01

    ... circuit controller operated by switch points or by switch locking mechanism. 236.303 Section 236.303... § 236.303 Control circuits for signals, selection through circuit controller operated by switch points or by switch locking mechanism. The control circuit for each aspect with indication more favorable...

  3. Microfluidic Serial Dilution Circuit

    PubMed Central

    Paegel, Brian M.; Grover, William H.; Skelley, Alison M.; Mathies, Richard A.; Joyce, Gerald F.

    2008-01-01

    In vitro evolution of RNA molecules requires a method for executing many consecutive serial dilutions. To solve this problem, a microfluidic circuit has been fabricated in a three-layer glass-PDMS-glass device. The 400-nL serial dilution circuit contains five integrated membrane valves: three two-way valves arranged in a loop to drive cyclic mixing of the diluent and carryover, and two bus valves to control fluidic access to the circuit through input and output channels. By varying the valve placement in the circuit, carryover fractions from 0.04 to 0.2 were obtained. Each dilution process, which is comprised of a diluent flush cycle followed by a mixing cycle, is carried out with no pipeting, and a sample volume of 400 nL is sufficient for conducting an arbitrary number of serial dilutions. Mixing is precisely controlled by changing the cyclic pumping rate, with a minimum mixing time of 22 s. This microfluidic circuit is generally applicable for integrating automated serial dilution and sample preparation in almost any microfluidic architecture. PMID:17073422

  4. Effects of Distributed Generation on Overcurrent Relay Coordination and an Adaptive Protection Scheme

    NASA Astrophysics Data System (ADS)

    Ilik, Semih C.; Arsoy, Aysen B.

    2017-07-01

    Integration of distributed generation (DG) such as renewable energy sources to electrical network becomes more prevalent in recent years. Grid connection of DG has effects on load flow directions, voltage profile, short circuit power and especially protection selectivity. Applying traditional overcurrent protection scheme is inconvenient when system reliability and sustainability are considered. If a fault happens in DG connected network, short circuit contribution of DG, creates additional branch element feeding the fault current; compels to consider directional overcurrent (OC) protection scheme. Protection coordination might get lost for changing working conditions when DG sources are connected. Directional overcurrent relay parameters are determined for downstream and upstream relays when different combinations of DG connected singular or plural, on radial test system. With the help of proposed flow chart, relay parameters are updated and coordination between relays kept sustained for different working conditions in DigSILENT PowerFactory program.

  5. Integrated circuits, and design and manufacture thereof

    DOEpatents

    Auracher, Stefan; Pribbernow, Claus; Hils, Andreas

    2006-04-18

    A representation of a macro for an integrated circuit layout. The representation may define sub-circuit cells of a module. The module may have a predefined functionality. The sub-circuit cells may include at least one reusable circuit cell. The reusable circuit cell may be configured such that when the predefined functionality of the module is not used, the reusable circuit cell is available for re-use.

  6. Reliability of Cascaded THz Frequency Chains with Planar GaAs Circuits

    NASA Technical Reports Server (NTRS)

    Maiwald, Frank; Schlecht, Erich; Lin, Robert; Ward, John; Pearson, John; Siegel, Peter; Mehdi, Imran

    2004-01-01

    Planar GaAs Schottky diodes will be utilized for all of the LO chains on the HIPI instrument for the Herschel Space Observatory. A better understanding of device degradation mechanisms is desirable in order to specify environmental and operational conditions that do not reduce device life times. Failures and degradation associated with ESD (Electrostatic Discharge), high temperatures, DC currents and RF induced current and heating have been investigated. The goal is to establish a procedure to obtain the safe operating range for a given frequency multiplier.

  7. Magnetic compression laser driving circuit

    DOEpatents

    Ball, D.G.; Birx, D.; Cook, E.G.

    1993-01-05

    A magnetic compression laser driving circuit is disclosed. The magnetic compression laser driving circuit compresses voltage pulses in the range of 1.5 microseconds at 20 kilovolts of amplitude to pulses in the range of 40 nanoseconds and 60 kilovolts of amplitude. The magnetic compression laser driving circuit includes a multi-stage magnetic switch where the last stage includes a switch having at least two turns which has larger saturated inductance with less core material so that the efficiency of the circuit and hence the laser is increased.

  8. Magnetic compression laser driving circuit

    DOEpatents

    Ball, Don G.; Birx, Dan; Cook, Edward G.

    1993-01-01

    A magnetic compression laser driving circuit is disclosed. The magnetic compression laser driving circuit compresses voltage pulses in the range of 1.5 microseconds at 20 Kilovolts of amplitude to pulses in the range of 40 nanoseconds and 60 Kilovolts of amplitude. The magnetic compression laser driving circuit includes a multi-stage magnetic switch where the last stage includes a switch having at least two turns which has larger saturated inductance with less core material so that the efficiency of the circuit and hence the laser is increased.

  9. 30 CFR 57.12069 - Lightning protection for telephone wires and ungrounded conductors.

    Code of Federal Regulations, 2012 CFR

    2012-07-01

    ... of the point where the circuit enters the mine. Lightning arrestors shall be connected to a low... 30 Mineral Resources 1 2012-07-01 2012-07-01 false Lightning protection for telephone wires and... AND NONMETAL MINES Electricity Surface Only § 57.12069 Lightning protection for telephone wires and...

  10. 30 CFR 57.12069 - Lightning protection for telephone wires and ungrounded conductors.

    Code of Federal Regulations, 2013 CFR

    2013-07-01

    ... of the point where the circuit enters the mine. Lightning arrestors shall be connected to a low... 30 Mineral Resources 1 2013-07-01 2013-07-01 false Lightning protection for telephone wires and... AND NONMETAL MINES Electricity Surface Only § 57.12069 Lightning protection for telephone wires and...

  11. 30 CFR 57.12069 - Lightning protection for telephone wires and ungrounded conductors.

    Code of Federal Regulations, 2014 CFR

    2014-07-01

    ... of the point where the circuit enters the mine. Lightning arrestors shall be connected to a low... 30 Mineral Resources 1 2014-07-01 2014-07-01 false Lightning protection for telephone wires and... AND NONMETAL MINES Electricity Surface Only § 57.12069 Lightning protection for telephone wires and...

  12. High voltage MOSFET switching circuit

    DOEpatents

    McEwan, Thomas E.

    1994-01-01

    The problem of source lead inductance in a MOSFET switching circuit is compensated for by adding an inductor to the gate circuit. The gate circuit inductor produces an inductive spike which counters the source lead inductive drop to produce a rectangular drive voltage waveform at the internal gate-source terminals of the MOSFET.

  13. Difference-Equation/Flow-Graph Circuit Analysis

    NASA Technical Reports Server (NTRS)

    Mcvey, I. M.

    1988-01-01

    Numerical technique enables rapid, approximate analyses of electronic circuits containing linear and nonlinear elements. Practiced in variety of computer languages on large and small computers; for circuits simple enough, programmable hand calculators used. Although some combinations of circuit elements make numerical solutions diverge, enables quick identification of divergence and correction of circuit models to make solutions converge.

  14. Bypassing An Open-Circuit Power Cell

    NASA Technical Reports Server (NTRS)

    Wannemacher, Harry E.

    1994-01-01

    Collection of bypass circuits enables battery consisting series string of cells to continue to function when one of its cells fails in open-circuit (high-resistance) condition. Basic idea simply to shunt current around defective cell to prevent open circuit from turning off battery altogether. Bypass circuits dissipate little power and are nearly immune to false activation.

  15. Graphene radio frequency receiver integrated circuit.

    PubMed

    Han, Shu-Jen; Garcia, Alberto Valdes; Oida, Satoshi; Jenkins, Keith A; Haensch, Wilfried

    2014-01-01

    Graphene has attracted much interest as a future channel material in radio frequency electronics because of its superior electrical properties. Fabrication of a graphene integrated circuit without significantly degrading transistor performance has proven to be challenging, posing one of the major bottlenecks to compete with existing technologies. Here we present a fabrication method fully preserving graphene transistor quality, demonstrated with the implementation of a high-performance three-stage graphene integrated circuit. The circuit operates as a radio frequency receiver performing signal amplification, filtering and downconversion mixing. All circuit components are integrated into 0.6 mm(2) area and fabricated on 200 mm silicon wafers, showing the unprecedented graphene circuit complexity and silicon complementary metal-oxide-semiconductor process compatibility. The demonstrated circuit performance allow us to use graphene integrated circuit to perform practical wireless communication functions, receiving and restoring digital text transmitted on a 4.3-GHz carrier signal.

  16. Graphene radio frequency receiver integrated circuit

    NASA Astrophysics Data System (ADS)

    Han, Shu-Jen; Garcia, Alberto Valdes; Oida, Satoshi; Jenkins, Keith A.; Haensch, Wilfried

    2014-01-01

    Graphene has attracted much interest as a future channel material in radio frequency electronics because of its superior electrical properties. Fabrication of a graphene integrated circuit without significantly degrading transistor performance has proven to be challenging, posing one of the major bottlenecks to compete with existing technologies. Here we present a fabrication method fully preserving graphene transistor quality, demonstrated with the implementation of a high-performance three-stage graphene integrated circuit. The circuit operates as a radio frequency receiver performing signal amplification, filtering and downconversion mixing. All circuit components are integrated into 0.6 mm2 area and fabricated on 200 mm silicon wafers, showing the unprecedented graphene circuit complexity and silicon complementary metal-oxide-semiconductor process compatibility. The demonstrated circuit performance allow us to use graphene integrated circuit to perform practical wireless communication functions, receiving and restoring digital text transmitted on a 4.3-GHz carrier signal.

  17. Rebamipide solution: a novel submucosal injection material to promote healing speed and healing quality of ulcers induced by endoscopic submucosal dissection.

    PubMed

    Fujimoto, Ai; Uraoka, Toshio; Nishizawa, Toshihiro; Shimoda, Masayuki; Goto, Osamu; Ochiai, Yasutoshi; Maehata, Tadateru; Akimoto, Teppei; Mitsunaga, Yutaka; Sasaki, Motoki; Yamamoto, Hiroyuki; Yahagi, Naohisa

    2018-04-01

    Rebamipide is administered perorally to protect the gastric mucosa. We assessed the efficacy and safety of a novel rebamipide solution as a submucosal injection material for endoscopic submucosal dissection (ESD) using an in vivo porcine model. An endoscopist blinded to the test agents performed ESDs of hypothetical 30 mm lesions using a 2% rebamipide solution at 2 sites (rebamipide group) and a saline solution at 2 other sites (control group) in the stomachs of 8 pigs. The technical outcomes were compared between the 2 groups. The gastric ulcer stages were evaluated by endoscopy once weekly for 4 weeks after the ESD to determine the healing score (1-6). The pigs were killed at 1 week (n = 2), 2 weeks (n = 2), and 4 weeks (n = 4) after the ESD for pathologic evaluation of ESD-induced ulcers and scarring. There were no significant differences in any of the technical outcomes between the 2 groups, and no adverse events related to the ESD in any of the animals. The healing score was significantly higher in the rebamipide group than in the control group at 2 weeks (P = .027), 3 weeks (P = .034), and 4 weeks (P = .012). In the histopathologic assessment, fibrosis was significantly less extensive in the rebamipide group than in the control group at 2 weeks (P = .02) and 4 weeks (P = .04). The rebamipide solution appeared to promote both the speed and quality of healing of ESD-induced ulcers by suppressing fibrosis. Copyright © 2018 American Society for Gastrointestinal Endoscopy. Published by Elsevier Inc. All rights reserved.

  18. Risk Factors of Post-Endoscopic Submucosal Dissection Electrocoagulation Syndrome for Colorectal Neoplasm.

    PubMed

    Ito, Sayo; Hotta, Kinichi; Imai, Kenichiro; Yamaguchi, Yuichiro; Kishida, Yoshihiro; Takizawa, Kohei; Kakushima, Naomi; Tanaka, Masaki; Kawata, Noboru; Yoshida, Masao; Ishiwatari, Hirotoshi; Matsubayashi, Hiroyuki; Ono, Hiroyuki

    2018-06-04

    Colorectal endoscopic submucosal dissection (ESD) is used for the treatment of large colorectal superficial neoplasms. However, there have been no large studies on electrocoagulation syndrome developing after colorectal ESD. The aim of this study was to clarify the incidence and clinical risk factors of post-ESD electrocoagulation syndrome (PECS). A total of 692 patients (median age, 70 years; 395 men) with 692 lesions, who underwent colorectal ESD at a tertiary cancer center between July 2010 and December 2015 were eligible. PECS was clinically diagnosed based on the presence of localized abdominal tenderness matching the ESD enforcement site, and fever (>37.5°C) or an inflammatory response (C-reactive protein level >0.5 mg/dL or leukocytosis >10000 cells/μL), without obvious findings of perforation, which developed at >6 h post-ESD. Outcomes of the procedure, the incidence of PECS, and risk factors associated with PECS were assessed. The incidence of PECS was 4.8% (33 patients), and all patients improved by conservative treatment. On multivariate analysis, the female sex (odds ratio [OR] 2.6; 95% confidence interval [95% CI], 1.2-5.7), tumor location at the cecum (OR 14.5; 95% CI: 3.7-53.7 vs rectum), and the presence of submucosal fibrosis (OR 2.8; 95% CI: 1.1-7.5) were found to be independent risk factors of PECS. This study identified the risk factors for PECS. Patients with high risk factors of PECS require careful management after colorectal ESD. This article is protected by copyright. All rights reserved.

  19. MULTIPLIER CIRCUIT

    DOEpatents

    Chase, R.L.

    1963-05-01

    An electronic fast multiplier circuit utilizing a transistor controlled voltage divider network is presented. The multiplier includes a stepped potentiometer in which solid state or transistor switches are substituted for mechanical wipers in order to obtain electronic switching that is extremely fast as compared to the usual servo-driven mechanical wipers. While this multiplier circuit operates as an approximation and in steps to obtain a voltage that is the product of two input voltages, any desired degree of accuracy can be obtained with the proper number of increments and adjustment of parameters. (AEC)

  20. Trigger Circuit.

    DTIC Science & Technology

    A wire of Nitinol can be stretched up to a given amount and will remain in this stretched state until heated to a critical temperature. When heated...circuit of this invention provides a current pulse for the required time period to heat the Nitinol wire to its critical temperature to thereby restore the...wire to its original length. The circuit includes a high power transistor which is gated on for a controlled time to provide the required power to heat the Nitinol wire to its critical temperature. (Author)

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