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Sample records for ferrite films grown

  1. As-grown enhancement of spinodal decomposition in spinel cobalt ferrite thin films by Dynamic Aurora pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Debnath, Nipa; Kawaguchi, Takahiko; Kumasaka, Wataru; Das, Harinarayan; Shinozaki, Kazuo; Sakamoto, Naonori; Suzuki, Hisao; Wakiya, Naoki

    2017-06-01

    Cobalt ferrite CoxFe3-xO4 thin films with composition within the miscibility gap were grown using Dynamic Aurora pulsed laser deposition. X-ray diffraction patterns reveal as-grown phase separation to Fe-rich and Co-rich phases with no post-deposition annealing. The interconnected surface microstructure of thin film shows that this phase separation occurs through spinodal decomposition enhanced by magnetic-field-induced ion-impingement. The lattice parameter variation of the thin films with the magnetic field indicates that the composition fluctuations can be enhanced further by increasing the magnetic field. Results show that spinodal decomposition enhancement by magnetic-field-induced ion-impingement is independent of the lattice-mismatch-induced strain. This approach can promote spinodal decomposition in any thin film with no post-deposition annealing process.

  2. Study of structural property of Co ferrite thin film grown by pulsed laser deposition technique

    NASA Astrophysics Data System (ADS)

    Nongjai, Razia; Khan, Shakeel; Ahmad, Hilal; Khan, Imran; Asokan, K.

    2012-06-01

    Thin film of Cobalt Ferrite was deposited on Si (1 0 0) substrate using Pulsed Laser Deposition (PLD) technique. The deposited film was characterized by X-ray Diffraction (XRD), X-ray reflectivity (XRR), Rutherford Backscattering Spectroscopy (RBS) and Raman Spectroscopy and was found to be single phase, textured along (1 1 1) directions and approximately matching the stoichoimetry of the target with negligible strain. The film had a very uniform and flat surface. Raman spectroscopy measurement further confirmed the formation of single phase cubic spinel structure. T2g Raman mode was missing from the spectra which may be due to cation redistribution and crystallite size effect.

  3. Nanocolumnar interfaces and enhanced magnetic coercivity in preferentially oriented cobalt ferrite thin films grown using oblique-angle pulsed laser deposition.

    PubMed

    Mukherjee, Devajyoti; Hordagoda, Mahesh; Hyde, Robert; Bingham, Nicholas; Srikanth, Hariharan; Witanachchi, Sarath; Mukherjee, Pritish

    2013-08-14

    Highly textured cobalt ferrite (CFO) thin films were grown on Si (100) substrates using oblique-angle pulsed laser deposition (α-PLD). X-ray diffraction and in-depth strain analysis showed that the obliquely deposited CFO films had both enhanced orientation in the (111) crystal direction as well as tunable compressive strains as a function of the film thicknesses, in contrast to the almost strain-free polycrystalline CFO films grown using normal-incidence PLD under the same conditions. Using in situ optical plume diagnostics the growth parameters in the α-PLD process were optimized to achieve smoother film surfaces with roughness values as low as 1-2 nm as compared to the typical values of 10-12 nm in the normal-incidence PLD grown films. Cross-sectional high resolution transmission electron microscope images revealed nanocolumnar growth of single-crystals of CFO along the (111) crystallographic plane at the film-substrate interface. Magnetic measurements showed larger coercive fields (∼10 times) with similar saturation magnetization in the α-PLD-grown CFO thin films as compared to those deposited using normal-incidence PLD. Such significantly enhanced magnetic coercivity observed in CFO thin films make them ideally suited for magnetic data storage applications. A growth mechanism based on the atomic shadowing effect and strain compression-relaxation mechanism was proposed for the obliquely grown CFO thin films.

  4. Influences of oxygen pressure on optical properties and interband electronic transitions in multiferroic bismuth ferrite nanocrystalline films grown by pulsed laser deposition.

    PubMed

    Jiang, K; Zhu, J J; Wu, J D; Sun, J; Hu, Z G; Chu, J H

    2011-12-01

    Bismuth ferrite (BiFeO(3)) nanocrystalline films with the crystalline size of 27-40 nm have been grown on c-sapphire substrates under various oxygen pressures of 1 × 10(-4) to 1 Pa by pulsed laser deposition. The X-ray diffraction spectra show that the films are polycrystalline and present the pure rhombohedral phase. It was found that the Raman-active phonon mode E(TO1) shifts towards a higher energy side from 74 to 76 cm(-1) with increasing oxygen pressure, indicating a larger tensile stress in the films deposited at higher oxygen pressure. The X-ray photoelectron spectroscopy analysis suggests that the concentrations of both Fe(2+) ions and oxygen vacancies in the BiFeO(3) films increase with decreasing oxygen pressure. Moreover, the dielectric functions in the photon energy range of 0.47-6.5 eV have been extracted by fitting the transmittance spectra with the Tauc-Lorentz dispersion model. From the transmittance spectra, the fundamental absorption edge is observed to present a redshift trend with increasing the temperature from 8 to 300 K. Note that the optical band gap (E(g)) decreases with increasing the temperature due to the electron-phonon interactions associated with the interatomic distance in the BiFeO(3) films. However, the E(g) decreases from 2.88 to 2.78 eV with decreasing oxygen pressure at 8 K, which can be attributed to the increment of oxygen vacancies leading to the formation of some impurity states between the valence and conduction band. It can be concluded that the oxygen pressure during the film fabrication has the significant effects on microstructure, optical properties, and electronic band structure modification of the BiFeO(3) films. © 2011 American Chemical Society

  5. Epitaxial single crystalline ferrite films for high frequency applications

    SciTech Connect

    Suzuki, Y.; Dover, R.B. van; Korenivski, V.; Werder, D.; Chen, C.H.; Felder, R.J.; Phillips, J.M.

    1996-11-01

    The successful growth of single crystal ferrites in thin film form is an important step towards their future incorporation into integrated circuits operating at microwave frequencies. The authors have successfully grown high quality single crystalline spinel ferrite thin films of (Mn,Zn)Fe{sub 2}O{sub 4} and CoFe{sub 2}O{sub 4} on (100) and (110) SrTiO{sub 3} and MgAl{sub 2}O{sub 4} at low temperature. These ferrite films are buffered with spinel structure layers that are paramagnetic at room temperature. In contrast to ferrite films grown directly on the substrates, ferrite films grown on buffered substrates exhibit excellent crystallinity and bulk saturation magnetization values, thus indicating the importance of lattice match and structural similarity between the film and the immediately underlying layer. X-ray, RBS, AFM and TEM analysis provide a consistent picture of the structural properties of these ferrite films. The authors then use this technique to grow exchange-coupled bilayers of single crystalline CoFe{sub 2}O{sub 4} and (Mn,Zn)Fe{sub 2}O{sub 4}. In these bilayers, they observe strong exchange coupling across the interface that is similar in strength to the exchange coupling in the individual layers.

  6. Control of magnetization reversal in oriented strontium ferrite thin films

    SciTech Connect

    Roy, Debangsu Anil Kumar, P. S.

    2014-02-21

    Oriented Strontium Ferrite films with the c axis orientation were deposited with varying oxygen partial pressure on Al{sub 2}O{sub 3}(0001) substrate using Pulsed Laser Deposition technique. The angle dependent magnetic hysteresis, remanent coercivity, and temperature dependent coercivity had been employed to understand the magnetization reversal of these films. It was found that the Strontium Ferrite thin film grown at lower (higher) oxygen partial pressure shows Stoner-Wohlfarth type (Kondorsky like) reversal. The relative importance of pinning and nucleation processes during magnetization reversal is used to explain the type of the magnetization reversal with different oxygen partial pressure during growth.

  7. Ferrite thin films for microwave applications

    SciTech Connect

    Zaquine, I.; Benazizi, H.; Mage, J.C.

    1988-11-15

    Production of ferrite thin films is the key to integration of microwave ferrite devices (circulators for phased array antennas, for instance). The interesting materials are the usual microwave ferrites: garnets, lithium ferrites, barium hexaferrites. The required thicknesses are a few tens of micrometers, and it will be important to achieve high deposition rates. Different substrates can be used: silicon and alumina both with and without metallization. The films were deposited by rf sputtering from a single target. The as-deposited films are amorphous and therefore require careful annealing in oxygen atmosphere. The sputtered films are a few micrometers thick on 4 in. substrates. The optimum annealing temperature was found by trying to obtain the highest possible magnetization for each ferrite. The precision on the value of magnetization is limited by the precision on the thickness of the film. We obtain magnetization values slightly lower than the target's. The ferromagnetic resonance linewidth was measured on toroids from 5 to 18 GHz.

  8. Ferrite thin films for microwave applications

    NASA Astrophysics Data System (ADS)

    Zaquine, I.; Benazizi, H.; Mage, J. C.

    1988-11-01

    This paper describes the preparation and the properties of thin (a few micron-thick) ferrite films for microwave applications. The films were deposited by RF sputtering from a single ferrite target on two different 4-in-thick substrates, silicon and alumina, both bare and metallized. The as-deposited films were amorphous, requiring careful annealing in oxygen atmosphere. The optimum annealing temperature was determined by obtaining the highest possible magnetization for each ferrite. The conditions of microwave measurements are described together with the results.

  9. Ferrite Nanoparticles, Films, Single Crystals, and Metamaterials: High Frequency Applications

    SciTech Connect

    Harris,V.

    2006-01-01

    Ferrite materials have long played an important role in power conditioning, conversion, and generation across a wide spectrum of frequencies (up to ten decades). They remain the preferred magnetic materials, having suitably low losses, for most applications above 1 MHz, and are the only viable materials for nonreciprocal magnetic microwave and millimeter-wave devices (including tunable filters, isolators, phase shifters, and circulators). Recently, novel processing techniques have led to a resurgence of research interest in the design and processing of ferrite materials as nanoparticles, films, single crystals, and metamaterials. These latest developments have set the stage for their use in emerging technologies that include cancer remediation therapies such as magnetohyperthermia, magnetic targeted drug delivery, and magneto-rheological fluids, as well as enhanced magnetic resonance imaging. With reduced dimensionality of nanoparticles and films, and the inherent nonequilibrium nature of many processing schemes, changes in local chemistry and structure have profound effects on the functional properties and performance of ferrites. In this lecture, we will explore these effects upon the fundamental magnetic and electronic properties of ferrites. Density functional theory will be applied to predict the properties of these ferrites, with synchrotron radiation techniques used to elucidate the chemical and structural short-range order. This approach will be extended to study the atomic design of ferrites by alternating target laser-ablation deposition. Recently, this approach has been shown to produce ferrites that offer attractive properties not found in conventionally grown ferrites. We will explore the latest research developments involving ferrites as related to microwave and millimeter-wave applications and the attempt to integrate these materials with semiconductor materials platforms.

  10. Preparation of NiZn ferrite films by spin-spray ferrite plating on oxygen-plasma-treated substrates

    NASA Astrophysics Data System (ADS)

    Zhang, Q.; Itoh, T.; Abe, M.; Tamaura, Y.

    1993-05-01

    Polycrystalline NixZnyFe3-x-yO4 films were prepared by the spin-spray ferrite plating method on oxygen-plasma-treated and non-plasma-treated glass substrates from an aqueous solution at 96 °C. The oxygen-plasma treatment increased film adhesion to the substrate, and enabled films thicker than 15 μm to be grown. A film with composition of (x+y)=0.75 had a saturation magnetization of 103 emu/g, a coercive force of ˜7 (Oe), ferromagnetic resonance linewidth (perpendicular to the film plane) of 80 (Oe), and resistivity of 106 Ω cm. These results compare favorably with ceramics of NiZn ferrite on the market.

  11. A comprehensive study of ferromagnetic resonance and structural properties of iron-rich nickel ferrite (NixFe3-xO4, x≤1) films grown by chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Pachauri, Neha; Khodadadi, Behrouz; Singh, Amit V.; Mohammadi, Jamileh Beik; Martens, Richard L.; LeClair, Patrick R.; Mewes, Claudia; Mewes, Tim; Gupta, Arunava

    2016-11-01

    We report a detailed study of the structural and ferromagnetic resonance properties of spinel nickel ferrite (NFO) films, grown on (100)-oriented cubic MgAl2O4 substrates by direct liquid injection chemical vapor deposition (DLI-CVD) technique. Three different compositions of NFO films (NixFe3-xO4 where x=1, 0.8, 0.6) deposited at optimized growth temperature of 600 °C are characterized using X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Vibrating Sample Magnetometry (VSM), and broadband ferromagnetic resonance (FMR) techniques. XRD confirms the growth of epitaxial, single crystalline NixFe3-xO4 films. The out-of-plane lattice constant (c) obtained for Ni0.8Fe2.2O4 film is slightly higher than the bulk value (0.833 nm), indicating only partial strain relaxation whereas for the other two compositions (x=1 and x=0.6) films exhibit complete relaxation. The in-plane and out-of-plane FMR linewidths measurements at 10 GHz give the lowest values of 458 Oe and 98 Oe, respectively, for Ni0.8Fe2.2O4 film as compared to the other two compositions. A comprehensive frequency (5-40 GHz) and temperature (10-300 K) dependent FMR study of the Ni0.8Fe2.2O4 sample for both in-lane and out-of-plane configurations reveals two magnon scattering (TMS) as the dominant in-plane relaxation mechanism. It is observed that the TMS contribution to the FMR linewidth scales with the saturation magnetization Ms. In-plane angle-dependent FMR measurements performed on the same sample show that the ferromagnetic resonance field (Hres) and the FMR linewidth (ΔH) have a four-fold symmetry that is consistent with the crystal symmetry of the spinel. SEM measurements show formation of pyramid-like microstructures at the surface of the Ni0.8Fe2.2O4 sample, which can explain the observed four-fold symmetry of the FMR linewidth.

  12. Pulsed-laser deposition of crystalline cobalt ferrite thin films at lower temperatures

    NASA Astrophysics Data System (ADS)

    Jiles, David; Raghunathan, Arun; Nlebedim, Ikenna; Snyder, John

    2010-03-01

    Cobalt ferrite thin films have been proposed for various engineering applications due to their exceptional magnetic, magnetoelastic, magnetotransport, magnetooptical properties. In this research, cobalt ferrite thin films were grown on SiO2/Si(100) substrates using pulsed-laser deposition (PLD) technique at substrate temperatures ranging from 250 C to 600 C. It has been shown in this study, that polycrystalline films with (111)-preferred orientation can be prepared at substrate temperatures as low as 250 C, as opposed to a report of optimum 600 C substrate temperature [1]. Thermal expansion mismatch between the film and substrate was found to have a substantial effect on the magnetic properties of the cobalt ferrite films, due to the large magnetoelastic coupling of cobalt ferrite. The growth of crystalline cobalt ferrite films at such low temperatures indicates the potential to use cobalt ferrite for MEMS devices and sensor applications [2] including integration with a wider range of multilayered device structures. This research was supported by the UK EPSRC (EP/D057094) and the US NSF (DMR-0402716). [1] J. Zhou et. al, Applied Surface Sciences, 253 (2007), p. 7456. [2] J. A. Paulsen et. al., Journal of Applied Physics, 97 (2005), p. 044502.

  13. Electrical transport properties of Fe 3- xCr xO 4 ferrite films on MgO (0 0 1) grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Lee, D. S.; Chern, G.

    2012-02-01

    In this report, we fabricated a series of Fe 3- xCr xO 4(0≦x≦2) films by plasma-oxygen-assisted molecular beam epitaxy (MBE) and did structural and electrical characterizations of these films. These films show textured single phase quality and the lattice parameters are consistent with those of the bulk at low Cr composition ( x<0.9). However, the lattice parameters show severe deviation from the bulk value in the intermediate region of 0.9≦x≦1.5 and no diffraction can be resolved at x∼2. These discrepancies may be attributed to the cation distributions and the instability of spinal structure as Cr concentration becomes dominant. The resistivity presents a typical Arrhenius temperature dependence with ρ= ρ0 exp ( Ep/ kBT) indicating that the transport is due to a hopping mechanism. The prefactor ρ0 increases in Fe 3- xCr xO 4, at smaller x but tends to level out for x>1, suggesting that Cr 3+ ions may start to replace Fe 3+ ions at the A site in the high x region. The activation energy of electrical hopping gradually increases at low Cr concentration but abruptly rises to ∼110 meV at x>0.9, suggesting a crossover from electron-hopping mediated transport to a thermally activated band gap excitation.

  14. Microwave magnetic properties of spinel ferrite films deposited by one-step electrochemical method

    NASA Astrophysics Data System (ADS)

    Zhang, Yao; Yuan, Lixin; Zhang, Xiaozhi; Zhang, Jie; Yue, Zhenxing; Li, Longtu

    2017-07-01

    Spinel ferrites have been widely used in microwave devices due to their excellent electromagnetic properties. In this study, two kinds of spinel ferrite films, Fe3O4 and Co xFe3-xO4, were grown on Pt(111)/Ti/SiO2/Si substrates by one-step electrochemical deposition method. The XRD and SEM characterizations demonstrated that the orientation of the ferrite films changed from (111) to (100) with the increase of depositing time. The cobalt content within Co xFe3-xO4 films was studied in detail by EDS analysis. The ferromagnetic resonance (FMR) responses of the ferrite films were measured by the flip-chip method using a vector network analyzer (VNA). It showed that the FMR frequency of Fe3O4 films reached to 10.5 GHz under an out-plane magnetic field of 5 kOe, while it reached to 27 GHz under an in-plane magnetic field of 5 kOe for Co xFe3-xO4 films. Meanwhile, whether the magnetic field was applied parallelly or perpendicularly, the resonant peaks were increased linearly with increasing the magnetic field, indicating that the films are promising candidates for applications in tunable wave-absorbing materials or other tunable frequency devices.

  15. High-Rate Deposition of Ferrite Films in Aqueous Solution by Light-Enhanced Ferrite Plating

    NASA Astrophysics Data System (ADS)

    Itoh, Tomoyuki; Hori, Seiichiro; Abe, Masanori; Tamaura, Yutaka

    1990-08-01

    By irradiating the substrate surface with a Xe-lamp at 450 W/cm2, the deposition rate of Fe3O4 film in ferrite plating was increased by a factor of 10 (from ˜ 30 nm/min to ˜ 320 nm/min). The high deposition rate in light-enhanced ferrite plating cannot be simply ascribed to the increase of thermal energy.

  16. Substrate temperature and oxygen pressure dependence of pulsed laser-deposited Sr ferrite films

    NASA Astrophysics Data System (ADS)

    Papakonstantinou, P.; O'Neill, M.; Atkinson, R.; Salter, I. W.; Gerber, R.

    1996-01-01

    The effect of substrate temperature and oxygen pressure on the microstructure, magnetic and magneto-optical properties of Sr ferrite (SrM) films grown on (001) single-crystal sapphire substrates by pulsed laser deposition has been investigated. Polycrystalline SrM films with perpendicular magnetic anisotropy could be prepared under a wide range of oxygen pressures and relatively high temperatures, sufficient to crystallise the material. However, an almost exclusive c-axis orientation normal to the film plane could be attained only at a narrow operational window centered at 0.1 mbar and 840°C. The magneto-optical properties of the films were comparable to those of the bulk barium hexaferrite single-crystal material. In addition, results obtained by atomic force microscopy provide convincing evidence that the growth of Sr ferrite on sapphire takes place by a spiral growth mechanism.

  17. Nanocrystalline zinc ferrite films studied by magneto-optical spectroscopy

    SciTech Connect

    Lišková-Jakubisová, E. Višňovský, Š.; Široký, P.; Hrabovský, D.; Pištora, J.; Sahoo, Subasa C.; Prasad, Shiva; Venkataramani, N.; Bohra, Murtaza; Krishnan, R.

    2015-05-07

    Ferrimagnetic Zn-ferrite (ZnFe{sub 2}O{sub 4}) films can be grown with the ferromagnetic resonance linewidth of 40 Oe at 9.5 GHz without going through a high temperature processing. This presents interest for applications. The work deals with laser ablated ZnFe{sub 2}O{sub 4} films deposited at O{sub 2} pressure of 0.16 mbar onto fused quartz substrates. The films about 120 nm thick are nanocrystalline and their spontaneous magnetization, 4πM{sub s}, depends on the nanograin size, which is controlled by the substrate temperature (T{sub s}). At T{sub s} ≈ 350 °C, where the grain distribution peaks around ∼20–30 nm, the room temperature 4πM{sub s} reaches a maximum of ∼2.3 kG. The films were studied by magnetooptical polar Kerr effect (MOKE) spectroscopy at photon energies between 1 and 5 eV. The complementary characteristics were provided by spectral ellipsometry (SE). Both the SE and MOKE spectra confirmed ferrimagnetic ordering. The structural details correspond to those observed in MgFe{sub 2}O{sub 4} and Li{sub 0.5}Fe{sub 2.5}O{sub 4} spinels. SE experiments confirm the insulator behavior. The films display MOKE amplitudes somewhat reduced with respect to those in Li{sub 0.5}Fe{sub 2.5}O{sub 4} and MgFe{sub 2}O{sub 4} due to a lower degree of spinel inversion and nanocrystalline structure. The results indicate that the films are free of oxygen vacancies and Fe{sup 3+}-Fe{sup 2+} exchange.

  18. Structural and magnetic studies of Cr doped nickel ferrite thin films

    NASA Astrophysics Data System (ADS)

    Panwar, Kalpana; Heda, N. L.; Tiwari, Shailja; Bapna, Komal; Choudhary, R. J.; Phase, D. M.; Ahuja, B. L.

    2016-05-01

    We have studied the structural and magnetic properties of Cr doped nickel ferrite thin films deposited on Si (100) and Si (111) using pulsed laser deposition technique. The films were deposited under vacuum and substrate temperature was kept at 700˚C. X-ray diffraction analysis revealed that films on both substrates have single phase cubic spinel structure. However, the film grown on Si (111) shows better crystalline behavior. Fourier transform infrared spectroscopy suggests that films on both substrates have mixed spinel structure. These films show magnetic hysteresis behavior and magnetization value of film on Si (100) is larger than that on Si (111). It turns out that structural and magnetic properties of these two films are correlated.

  19. Structural and magnetic studies of Cr doped nickel ferrite thin films

    SciTech Connect

    Panwar, Kalpana; Heda, N. L.; Tiwari, Shailja; Bapna, Komal; Ahuja, B. L.; Choudhary, R. J.; Phase, D. M.

    2016-05-23

    We have studied the structural and magnetic properties of Cr doped nickel ferrite thin films deposited on Si (100) and Si (111) using pulsed laser deposition technique. The films were deposited under vacuum and substrate temperature was kept at 700°C. X-ray diffraction analysis revealed that films on both substrates have single phase cubic spinel structure. However, the film grown on Si (111) shows better crystalline behavior. Fourier transform infrared spectroscopy suggests that films on both substrates have mixed spinel structure. These films show magnetic hysteresis behavior and magnetization value of film on Si (100) is larger than that on Si (111). It turns out that structural and magnetic properties of these two films are correlated.

  20. Direct formation of ferrite films in wet process

    NASA Astrophysics Data System (ADS)

    Abe, M.; Tanno, Y.; Tamaura, Y.

    1985-04-01

    We have prepared a polycrystalline Co-ferrite film by the electroless ferrite-plating technique of our invention [J. Appl. Phys. 55, 2614 (1984)] in an aqueous solution at 70 °C on substrates of organic compounds (polyethylene terephthalate, polymethyl methacrylate, polycarbonate, Teflon), a stainless steel, and a polyester fiber. We used no intermediate layer, which we needed previously to enhance the adhesion of the ferrite film to the surface. By exposing the organic substrates to an rf-excited air plasma, the wettability of the surface improved, which enhanced the adhesion of the film to the substrate. Here we have measured the adhesion by a cross-cut test. The plasma forms hydrophilic groups such as -OH and -COOH, which improve the wettability. The OH group adsorbs the metal ions in the reaction solution, initiating the ferrite film formation. The glass shows a strong adhesion to the film even when it is not exposed to the plasma, because the glass has the OH group on the surface inherently. The stainless steel does not enhance the adhesion by the plasma treatment because the plasma forms no OH group on the metal surface. The adhesion power higher than ˜10 kg/cm2 has been obtained between the Co-ferrite film and the glass (not plasma treated), the polyethylene terephthalate (plasma treated) and the Teflon (plasma treated).

  1. Mössbauer and magnetic properties of coherently mixed magnetite-cobalt ferrite grown by infrared pulsed-laser deposition

    DOE PAGES

    de la Figuera, Juan; Quesada, Adrian; Martín-García, Laura; ...

    2016-01-13

    We have studied the magnetic properties and the composition of cobalt ferrite single crystal films on SrTiO3: Nb grown by infrared pulsed-laser deposition. Mössbauer spectra have been recorded from both the target used to grow the films and the films themselves. The Mössbauer spectra of the target taken at low temperatures show a strong dependence of the recoil free fraction of the octahedral sites with temperature. The films composition, with a coexistence of Co-enriched cobalt ferrite and magnetite, has been estimated assuming a similar ratio of the recoil free fractions of the films. X-ray absorption and x-ray magnetic circular dichroismmore » measurements confirm the valence composition of the film and show ferromagnetic Fe-Co coupling in the films with a coercive field around 0.5 T at room temperature. The combination of these characterization techniques allows establishin g the coherent structural and magnetic properties of this biphase system.« less

  2. Mössbauer and magnetic properties of coherently mixed magnetite-cobalt ferrite grown by infrared pulsed-laser deposition

    SciTech Connect

    de la Figuera, Juan; Quesada, Adrian; Martín-García, Laura; Sanz, Mikel; Oujja, Mohamed; Castillejo, Marta; Mascaraque, Arantzazu; N'Diaye, Alpha T.; Foerster, Michael; Aballe, Lucia; Marco, Jose F.

    2016-01-13

    We have studied the magnetic properties and the composition of cobalt ferrite single crystal films on SrTiO3: Nb grown by infrared pulsed-laser deposition. Mössbauer spectra have been recorded from both the target used to grow the films and the films themselves. The Mössbauer spectra of the target taken at low temperatures show a strong dependence of the recoil free fraction of the octahedral sites with temperature. The films composition, with a coexistence of Co-enriched cobalt ferrite and magnetite, has been estimated assuming a similar ratio of the recoil free fractions of the films. X-ray absorption and x-ray magnetic circular dichroism measurements confirm the valence composition of the film and show ferromagnetic Fe-Co coupling in the films with a coercive field around 0.5 T at room temperature. The combination of these characterization techniques allows establishin g the coherent structural and magnetic properties of this biphase system.

  3. Dielectric Spectroscopy of Localized Electrical Charges in Ferrite Thin Film

    NASA Astrophysics Data System (ADS)

    Abdellatif, M. H.; Azab, A. A.; Moustafa, A. M.

    2017-09-01

    A thin film of Gd-doped Mn-Cr ferrite has been prepared by pulsed laser deposition from a bulk sample of the same ferrite prepared by the conventional double sintering ceramic technique. The charge localization and surface conduction in the ferromagnetic thin film were studied. The relaxation of the dielectric dipoles after exposure to an external alternating-current (AC) electric field was investigated. The effect of charge localization on the real and imaginary parts of the dielectric modulus was studied. The charge localization in the thin film was enhanced and thereby the Maxwell-Wagner-type interfacial polarization. The increase in interfacial polarization is a direct result of the enhanced charge localization. The sample was characterized in terms of its AC and direct-current (DC) electrical conductivity, and thermally stimulated discharge current.

  4. Thin-film ferrites vapor deposited by one-step process in vacuum

    NASA Technical Reports Server (NTRS)

    Hacskaylo, M.

    1966-01-01

    Thin-film ferrites are formed by vapor deposition of a mixture of powdered ferrites and powdered boron oxide at controlled temperatures in a vacuum chamber. These films are used in memory devices for computers and as thin-film inductors in communications and telemetry systems.

  5. New Magnetic Materials and Phenomena for Radar and Microwave Signal Processing Devices - Bulk and Thin Film Ferrites and Metallic Films

    DTIC Science & Technology

    2009-02-15

    deposited and liquid phase epitaxy films of low loss cubic yttrium iron garnet (YIG) and lithium ferrite , uniaxial barium hexaferrite, and planar zinc ...barium hexaferrite with losses which are as good as the best bulk single crystals, and (9) the successful PLD growth of low loss zinc lithium ferrite ...Signal Processing Devices - Bulk and Thin Film Ferrites and Metallic Films ONR N00014-07-1-0597, 02 February 2007 - 30 September 2008 Carl E

  6. Investigation of single crystal ferrite thin films

    NASA Technical Reports Server (NTRS)

    Mee, J. E.; Besser, P. J.; Elkins, P. E.; Glass, H. L.; Whitcomb, E. C.

    1972-01-01

    Materials suitable for use in magnetic bubble domain memories were developed for aerospace applications. Practical techniques for the preparation of such materials in forms required for fabrication of computer memory devices were considered. The materials studied were epitaxial films of various compositions of the gallium-substituted yttrium gadolinium iron garnet system. The major emphasis was to determine their bubble properties and the conditions necessary for growing uncracked, high quality films.

  7. Growth, structure, morphology, and magnetic properties of Ni ferrite films

    PubMed Central

    2013-01-01

    The morphology, structure, and magnetic properties of nickel ferrite (NiFe2O4) films fabricated by radio frequency magnetron sputtering on Si(111) substrate have been investigated as functions of film thickness. Prepared films that have not undergone post-annealing show the better spinel crystal structure with increasing growth time. Meanwhile, the size of grain also increases, which induces the change of magnetic properties: saturation magnetization increased and coercivity increased at first and then decreased. Note that the sample of 10-nm thickness is the superparamagnetic property. Transmission electron microscopy displays that the film grew with a disorder structure at initial growth, then forms spinel crystal structure as its thickness increases, which is relative to lattice matching between substrate Si and NiFe2O4. PMID:23622034

  8. Fabrication of ultrathin Ni-Zn ferrite films using electron cyclotron resonance sputtering method

    SciTech Connect

    Tanaka, Terumitsu; Kurisu, Hiroki; Matsuura, Mitsuru; Shimosato, Yoshihiro; Okada, Shigenobu; Oshiro, Kazunori; Fujimori, Hirotaka; Yamamoto, Setsuo

    2006-04-15

    Well-crystallized Ni-Zn ferrite (Ni{sub 0.4}Zn{sub 0.6}Fe{sub 2}O{sub 4}) highly oriented ultrathin films were obtained at a substrate temperature of 200 deg. C by a reactive sputtering method utilizing electron cyclotron resonance microwave plasma, which is very effective to crystallize oxide or nitride materials without heat treatment. Thin films of Ni-Zn ferrite deposited on a MgO (100) underlayer showed an intense X-ray-diffraction peak of (400) from the Ni-Zn ferrite as compared to similar films deposited directly onto thermally oxidized Si substrates. A 1.5-nm-thick Ni-Zn ferrite film, which corresponds to twice the lattice constant for bulk Ni-Zn ferrite, crystallized on a MgO (100) underlayer.

  9. Ferroelectric behavior in bismuth ferrite thin films of different thickness.

    PubMed

    Wu, Jiagang; Wang, John; Xiao, Dingquan; Zhu, Jianguo

    2011-09-01

    The ferroelectric behavior of BiFeO(3) thin films is modified by changing the film thicknesses, where the BiFeO(3) thin films with different thicknesses were grown on SrRuO(3)/Pt/TiO(2)/SiO(2)/Si(100) substrates by radio frequency sputtering. The mixture of (110) and (111) orientations is induced for all BiFeO(3) thin films regardless of their thicknesses, together with the columnar structure and the dense microstructure. Their dielectric behavior is almost independent of the film thickness where all thin films have a low dielectric loss. A giant remanent polarization of 2P(r) ≈ 156.6-188.8 μC/cm(2) is induced for the BiFeO(3) thin films in the thickness range of 190-600 nm. As a result, it is an effective way to improve the ferroelectric behavior of the BiFeO(3) thin film by tailoring the film thickness.

  10. Diamond films grown from fullerene precursors

    SciTech Connect

    Gruen, D.M.; Zuiker, C.D.; Krauss, A.R.

    1995-07-01

    Fullerene precursors have been shown to result in the growth of diamond films from argon microwave plasmas. In contradistinction to most diamond films grown using conventional methane-hydrogen mixtures, the fullerene-generated films are nanocrystalline and smooth on the nanometer scale. They have recently been shown to have friction coefficients approaching the values of natural diamond. It is clearly important to understand the development of surface morphology during film growth from fullerene precursors and to elucidate the factors leading to surface roughness when hydrogen is present in the chemical vapor deposition (CVD) gas mixtures. To achieve these goals, we are measuring surface reflectivity of diamond films growing on silicon substrates over a wide range of plasma processing conditions. A model for the interpretation of the laser interferometric data has been developed, which allows one to determine film growth rate, rms surface roughness, and bulk losses due to scattering and absorption. The rms roughness values determined by reflectivity are in good agreement with atomic force microscope (AFM) measurements. A number of techniques, including high-resolution transmission electron microscopy (HRTEM) and near-edge x-ray absorption find structure (NEXAFS) measurements, have been used to characterize the films. A mechanism for diamond-film growth involving the C{sub 2} molecule as a growth species will be presented. The mechanism is based on (1) the observation that the optical emission spectra of the fullerene- containing plasmas are dominated by the Swan bands of C{sub 2} and (2) the ability of C{sub 2} to insert directly into C-H and C-C bonds with low activation barriers, as shown by recent theoretical calculations of reactions of C{sub 2} with carbon clusters.

  11. Realization of hexagonal barium ferrite thick films on Si substrates using a screen printing technique

    NASA Astrophysics Data System (ADS)

    Chen, Yajie; Smith, Ian; Geiler, Anton L.; Vittoria, Carmine; Zagorodnii, Volodymyr; Celinski, Zbigniew; Harris, Vincent G.

    2008-05-01

    Hexagonal barium ferrite thick films (50-200 µm) have been deposited on Si and Al2O3/Si substrates using a screen printing technique. X-ray diffractometry, scanning electron microscopy and magnetometry were used to characterize and correlate the ferrite films' microstructure and magnetic properties. The experiments indicated that an Al2O3 underlayer was effective in preventing silicon diffusion into the barium ferrite films during a final sintering treatment at temperatures above 1100 °C. A two-stage sintering process allowed a reasonable tradeoff between mechanical and magnetic properties. This work reveals the feasibility of fabrication of thick ferrite films on large substrates (up to 25 mm in diameter) for future planar microwave devices compatible with semiconductor integrated circuits processing.

  12. Investigation of frequency response of microwave active ring resonator based on ferrite film

    NASA Astrophysics Data System (ADS)

    Martynov, M. I.; Nikitin, A. A.; Ustinov, A. B.; Kalinikos, B. A.

    2016-11-01

    The complex transmission coefficient of active ring resonators based on ferrite-film delay lines was investigated both theoretically and experimentally. Influence of the parameters of the delay line on the transmission coefficients was investigated. It was shown that the resonant frequencies of the ring depend on the ferrite film thickness and the distance between spin-wave antennae. These dependences give possibility to control the shape of the transmission coefficient that in combination with magnetic tuning provide flexibility for microwave applications.

  13. Morphological Evolution of Oxide Scales Grown on Ferritic Steels in Steam

    SciTech Connect

    Wright, Ian G; Howe, Jane Y; Sabau, Adrian S

    2009-01-01

    This study is concerned with the thermally-grown oxide scales formed inside tubes in a steam boiler during normal operation, and the influence of the morphological evolution of those scales on how strains are developed and accommodated. Understanding such details is an important consideration in modeling the tendency for scale spallation or exfoliation. Overall, the scales formed on ferritic steels in steam can be simplistically described as a layer of essentially pure magnetite in contact with the steam, and a second layer of magnetite containing alloying elements (especially Cr) next to the alloy. Hematite also can develop as a third, outermost oxide layer that may be non-uniform in thickness, and penetrate inwards along grain boundaries in the magnetite layer. A peculiar variant of this morphology often reported on low-alloy ferritic steels after boiler service (but not on laboratory-oxidized specimens) has a relatively thick outer magnetite layer and multiple inner layers described as decreasing in thickness as the alloy surface is approached. These inner layers appear to be repeating sets of double layers of pure magnetite and magnetite containing alloying elements. The results of detailed examination of such multi-layered morphology and the implications for the mode of scale growth and failure are discussed.

  14. Effect of deposition pressure on the structural and magnetic properties of cobalt ferrite thin films

    SciTech Connect

    Nongjai, R.; Khan, S.; Ahmad, H.; Khan, I.; Asokan, K.

    2013-06-03

    We present the influence of deposition pressure on the structural and magnetic properties of cobalt ferrite thin films. Thin films of Co ferrite were deposited by rf sputtering on Si (100) substrate and characterized by X - Ray Diffraction (XRD), Atomic Force Microscopy (AFM) and Vibrating Sample Magnetometer (VSM). The XRD patterns showed the formation of crystalline single phase of the films. The particle size and surface roughness of the films were strongly influence by gas pressure. Hysteresis loops measured at room temperature showed the enhancement of magnetic properties with the increase of gas pressure which is attributed to the decrease of particle size.

  15. Dielectric properties of cobalt ferrite nanoparticles in ultrathin nanocomposite films.

    PubMed

    Alcantara, Gustavo B; Paterno, Leonardo G; Fonseca, Fernando J; Pereira-da-Silva, Marcelo A; Morais, Paulo C; Soler, Maria A G

    2013-12-07

    Multilayered nanocomposite films (thickness 50-90 nm) of cobalt ferrite nanoparticles (np-CoFe2O4, 18 nm) were deposited on top of interdigitated microelectrodes by the layer-by-layer technique in order to study their dielectric properties. For that purpose, two different types of nanocomposite films were prepared by assembling np-CoFe2O4 either with poly(3,4-ethylenedioxy thiophene):poly(styrene sulfonic acid) or with polyaniline and sulfonated lignin. Despite the different film architectures, the morphology of both was dominated by densely-packed layers of nanoparticles surrounded by polyelectrolytes. The dominant effect of np-CoFe2O4 was also observed after impedance spectroscopy measurements, which revealed that dielectric behavior of the nanocomposites was largely influenced by the charge transport across nanoparticle-polyelectrolyte interfaces. For example, nanocomposites containing np-CoFe2O4 exhibited a single low-frequency relaxation process, with time constants exceeding 15 ms. At 1 kHz, the dielectric constant and the dissipation factor (tan δ) of these nanocomposites were 15 and 0.15, respectively. These values are substantially inferior to those reported for pressed pellets made exclusively of similar nanoparticles. Impedance data were further fitted with equivalent circuit models from which individual contributions of particle's bulk and interfaces to the charge transport within the nanocomposites could be evaluated. The present study evidences that such nanocomposites display a dielectric behavior dissimilar from that exhibited by their individual counterparts much likely due to enlarged nanoparticle-polyelectrolyte interfaces.

  16. Optical phenomena in bismuth-substituted ferrite-garnet films in external electric field

    NASA Astrophysics Data System (ADS)

    Koronovskyy, V. E.

    2009-05-01

    Magneto-electric properties of bismuth-substituted ferrite-garnet epitaxial films and yttrium ferrite-garnet films have been investigated by using optical polarimetry method, electromagneto-optical (EMO) effect. The EMO effect in the transverse electric ( E) field was measured. In the yttrium ferrite-garnet films, the EMO effect in the specified geometry is not registered, though in a longitudinal E-field, it was observed by us. The EMO effect in separate multidomain areas of bismuth-substituted ferrite-garnet films was registered in the transverse electric field. A weak hysteresis appears in the magnetic-field dependences of the measured effect. A value of the EMO signal considerably depends on the external magnetic field, and in the homogeneously magnetized films, the EMO effect is practically absent. The irradiation of bismuth-substituted ferrite-garnet films by powerful laser impulse leads to increase of the EMO signal that can be a result of removal, in them, of nonuniform pressure.

  17. Oriented Y-type hexagonal ferrite thin films prepared by chemical solution deposition

    SciTech Connect

    Buršík, J.; Kužel, R.; Knížek, K.; Drbohlav, I.

    2013-07-15

    Thin films of Ba{sub 2}Zn{sub 2}Fe{sub 12}O{sub 22} (Y) hexaferrite were prepared through the chemical solution deposition method on SrTiO{sub 3}(1 1 1) (ST) single crystal substrates using epitaxial SrFe{sub 12}O{sub 19} (M) hexaferrite thin layer as a seed template layer. The process of crystallization was mainly investigated by means of X-ray diffraction and atomic force microscopy. A detailed inspection revealed that growth of seed layer starts through the break-up of initially continuous film into isolated grains with expressive shape anisotropy and hexagonal habit. The vital parameters of the seed layer, i.e. thickness, substrate coverage, crystallization conditions and temperature ramp were optimized with the aim to obtain epitaxially crystallized Y phase. X-ray diffraction Pole figure measurements and Φ scans reveal perfect parallel in-plane alignment of SrTiO{sub 3} substrate and both hexaferrite phases. - Graphical abstract: XRD pole figure and AFM patterns of Ba{sub 2}Zn{sub 2}Fe{sub 12}O{sub 22} thin film epitaxially grown on SrTiO{sub 3}(1 1 1) single crystal using seeding layer templating. - Highlights: • Single phase Y-type hexagonal ferrite thin films were prepared by CSD method. • Seed M layer breaks into isolated single crystal islands and serves as a template. • Large seed grains grow by consuming the grains within the bulk of recoated film. • We explained the observed orientation relation of epitaxial domains. • Epitaxial growth on SrTiO{sub 3}(1 1 1) with relation (0 0 1){sub M,Y}//(1 1 1){sub ST}+[1 0 0]{sub M,Y}//[2 −1 −1]{sub ST}.

  18. Thickness dependence of the preferred orientation of Mn-Zn ferrite thin films deposited by ion-beam sputtering

    NASA Astrophysics Data System (ADS)

    Cho, Hae Seok; Kim, Hyeong Joon

    1995-07-01

    The thickness dependence of the preferred orientation of the Cu or Ti added Mn-Zn ferrite thin films deposited on SiO2(1000 Å)/Si(100) at 350 °C by ion-beam sputtering was investigated. A mosaic target, consisting of a single-crystal (110) Mn-Zn ferrite with a metal strip on it, was employed as the target. The (hhh) preferred orientation, formed at the initial growth stage, of the Cu added Mn-Zn ferrite film changed to the (h00) preferred orientation with increasing film thickness, while the initially formed (h00) preferred orientation of the Ti added one was enhanced with increasing film thickness. Such different behaviors were discussed in terms of the surface energy and the preferred growth orientation of the ferrite film. The thickness dependence of magnetic properties of the ferrite films was also investigated.

  19. Neutron diffraction and ferromagnetic resonance studies on plasma-sprayed MnZn ferrite films

    SciTech Connect

    Yan, Q.Y.; Gambino, R.J.; Sampath, S.; Huang, Q.

    2005-02-01

    The magnetic properties of MnZn ferrites are affected by the plasma spray process. It is found that improvements can be made by annealing the ferrite films at 500 deg. C - 800 deg. C. The annealing induced magnetic property changes are studied by neutron diffraction and ferromagnetic resonance techniques. The increase of the saturation magnetization is attributed to the cation ordering within the spinel lattice, which increases the magnetic moment per ferrite formula. The refinements on the neutron diffraction data suggest that the redistribution of the cation during annealing neither starts from a fully disordered state nor ends to a fully ordered state. The decrease of the coercivity is analyzed with the domain wall pinning model. The measurements on the magnetostriction and residual stress indicate that coercive mechanisms arising from the magnetoelastic energy term are not dominant in these ferrite films. The decrease of the coercivity for annealed ferrite films is mainly attributed to the decrease of the effective anisotropic field, which may result from the homogenization of the film composition and the reduction of the microstructural discontinuity (e.g., cracks, voids, and splat boundaries)

  20. Application of domain structures elements of ferrite-garnet films for transport of magnetic microparticles

    NASA Astrophysics Data System (ADS)

    Gorobets, Yu. I.; Dzhezherya, Yu. I.; Melnichuk, I. A.; Cherepov, S. V.; Kuz', A. P.

    2010-12-01

    The physical background of the device for the transportation of magnetic microparticles which is using a domain structure of garnete-ferrite films with easy-plane anisotropy are developed and experimentally proved in the present paper. The proposed device can be used in microbiology, medicine, and genetic engineering.

  1. High-frequency magnetic properties of Zn ferrite films deposited by magnetron sputtering

    SciTech Connect

    Guo Dangwei; Zhu Jingyi; Yang Yuancai; Fan Xiaolong; Chai Guozhi; Sui Wenbo; Zhang Zhengmei; Xue Desheng

    2010-02-15

    The effect of thermal annealing on structural and magnetic properties has been investigated for Zn ferrite films deposited on Si (111) substrates using radio frequency magnetron sputtering. The saturation magnetization at room temperature was enhanced upto 303 emu/cm{sup 3} by annealing at relatively low temperature of 200 deg. C and decreased at higher temperatures. The complex permeability {mu}={mu}{sup '}-i{mu}{sup ''} values of the ferrite films as-deposited and annealed at 200 and 400 deg. C were measured at frequency upto 5 GHz. These films exhibited better high-frequency properties, especially, the film annealed at 200 deg. C had a large {mu}{sup '} of 19.5 and high resonance frequency f{sub r} of 1.61 GHz. And the reason was investigated preliminarily based on the bianisotropy model.

  2. Exchange coupling driven omnidirectional rotatable anisotropy in ferrite doped CoFe thin film

    PubMed Central

    Chai, Guozhi; Phuoc, Nguyen N.; Ong, C. K.

    2012-01-01

    Isotropic magnetic materials with high resonant frequencies are useful for applications in microwave devices. Undoped CoFe thin films, as common soft magnetic materials with high saturation magnetization, show isotropic characteristics but no high frequency response. Here, we use ferrite doped CoFe thin film to realize a resonant frequency higher than 4.5 GHz at all orientations. The exchange coupling between ferrimagnet and ferromagnet is assumed to play a key role on the omnidirectional rotatable anisotropy. PMID:23145323

  3. Exchange coupling driven omnidirectional rotatable anisotropy in ferrite doped CoFe thin film.

    PubMed

    Chai, Guozhi; Phuoc, Nguyen N; Ong, C K

    2012-01-01

    Isotropic magnetic materials with high resonant frequencies are useful for applications in microwave devices. Undoped CoFe thin films, as common soft magnetic materials with high saturation magnetization, show isotropic characteristics but no high frequency response. Here, we use ferrite doped CoFe thin film to realize a resonant frequency higher than 4.5 GHz at all orientations. The exchange coupling between ferrimagnet and ferromagnet is assumed to play a key role on the omnidirectional rotatable anisotropy.

  4. Highly resistive Mn-Zn ferrite films prepared from aqueous solution for GHz conducted noise suppressors

    NASA Astrophysics Data System (ADS)

    Matsushita, Nobuhiro; Abe, Tatsunobu; Kondo, Koichi; Yoshida, Shigeyoshi; Abe, Masanori

    2005-05-01

    We have prepared Mn-Zn ferrite films (MnxZnyFezO4.00-δ: 0.23film resistivity ρ increased as the amount of Fe content z decreased and very high surface resistance R>108Ω/sq was attained for the film having z<2.6. The deposited Mn-Zn ferrite films had a large saturation magnetization Ms=380-460emu/cm3 and relatively low coercivity Hc=11-29Oe. The Mn-Zn ferrite films contacted to a microstrip line (50Ω) exhibited very large transmission loss ΔPloss per thickness t, ΔPloss/t, of about 10 times larger than that of commercialized composite sheet. They exhibited sufficiently low reflection coefficient S11<-10dB. These films were applicable as noise current suppressors deposited on an interlayer of multilayer printed circuit boards.

  5. Visualizing weak ferromagnetic domains in multiferroic hexagonal ferrite thin film

    NASA Astrophysics Data System (ADS)

    Wang, Wenbo; Mundy, Julia A.; Brooks, Charles M.; Moyer, Jarrett A.; Holtz, Megan E.; Muller, David A.; Schlom, Darrell G.; Wu, Weida

    2017-04-01

    We report cryogenic magnetic force microscopy (MFM) studies of a 200-nm-thick hexagonal (h ) LuFeO3 film grown by molecular-beam epitaxy on a (111)-oriented yttria-stabilized cubic-zirconia substrate. Labyrinthlike domains ˜1.8 μ m in size were observed after zero-field cooling below the Néel temperature, TN≈147 K, where weak ferromagnetic order (P 63 cm) with a canted moment of MS≈0.02 μB/f .u . exists. At 6 K, MFM images of the magnetization reversal process reveal a typical domain behavior of a pinning-dominated hard magnet. The pinning strength is substantially reduced at elevated temperature. The temperature dependence of the domain contrast demonstrates that our MFM is able to detect the domain contrast of magnets with tiny magnetic moments (˜0.002 μB/f .u . ). An upper limit of the linear magnetoelectric coefficient of h -LuFeO3 (αz z<6 ps /m ) is estimated by magnetoelectric force microscopy measurements.

  6. Columnar grown copper films on polyimides strained beyond 100%

    PubMed Central

    Sun, Jeong-Yun; Lee, Hae-Ryung; Hwan Oh, Kyu

    2015-01-01

    Many flexible electronic devices contain metal films on polymer substrates to satisfy requirements for both electrical conductivity and mechanical durability. Despite numerous trials to date, the stretchability of metal interconnects remains an issue. In this paper, we have demonstrated a stretchable metal interconnect through control of the texture of a copper film with columnar grown grains on a polyimide (PI) substrate. The columnar grown copper films (CGC films) were deposited by regulating radio frequency (RF) sputtering powers. CGC films were able to sustain their electrical conductivity at strains above 100%. Instead of ultimate electrical discontinuity by channel crack propagation, CGC films maintained their conductivity by forming ligament structures, or a ‘conductive net,’ through trapped micro-cracks. XRD, AFM and in situ SEM analysis were used to investigate these stretchable conductors. PMID:26337668

  7. Yttria-Stabilized Zirconia Ceramic Deposition on SS430 Ferritic Steel Grown by PLD - Pulsed Laser Deposition Method

    NASA Astrophysics Data System (ADS)

    Khalid Rivai, Abu; Mardiyanto; Agusutrisno; Suharyadi, Edi

    2017-01-01

    Development of high temperature materials are one of the key issues for the deployment of advanced nuclear reactors due to higher temperature operation. One of the candidate materials for that purpose is ceramic-coated ferritic steel that one of the functions is to be a thermal barrier coating (TBC). Thin films of YSZ (Ytrria-Stabilized Zirconia) ceramic have been deposited on a SS430 ferritic steel using Pulsed Laser Deposition (PLD) at Center For Science and Technology of Advanced Materials laboratory – National Nuclear Energy Agency of Indonesia (BATAN). The thin film was deposited with the chamber pressure range of 200-225 mTorr, the substrate temperature of 800oC, and the number of laser shots of 3×104, 6×104 and 9×104. Afterward, the samples were analyzed using Scanning Electron Microscope – Energy Dispersive X-ray Spectroscope (SEM-EDS), X-Ray Diffractometer (XRD), Atomic Force Microscope (AFM) and Vickers hardness tester. The results showed that the YSZ could homogeneously and sticky deposited on the surface of the ferritic steel. The surfaces were very smoothly formed with the surface roughness was in the range of 70 nm. Furthermore, thickness, composition of Zr4+ dan Y3+, the crystallinity, and hardness property was increased with the increasing the number of the shots.

  8. Room temperature ferrimagnetism and low temperature disorder effects in zinc ferrite thin films

    NASA Astrophysics Data System (ADS)

    Raghavan, Lisha; Pookat, Geetha; Thomas, Hysen; Ojha, Sunil; Avasthi, D. K.; Anantharaman, M. R.

    2015-07-01

    Zinc ferrite is a normal spinel and antiferromagnetic in nature with a Neel temperature of 10 K in the micron regime. It exhibits interesting features like superparamagnetism, spin glass and ferrimagnetism in the nano-regime. These anomalies make zinc ferrite striking among various other spinels. Further, in the thin film form, the magnetic properties are dependent on preparative techniques, annealing and deposition parameters. In the present work, zinc ferrite thin films were prepared by RF sputtering. The films were annealed at 400° C and 600° C. The thickness and composition of films were estimated by employing Rutherford Backscattering Spectrometry (RBS). The structural and microstructural studies conducted using Glancing X Ray Diffractometer (GXRD) and Transmission Electron Microscope (TEM) indicates the formation of a spinel phase and grain growth was observed with annealing. Magnetic measurements were carried out using a Superconducting Quantum Interferometer Device-Vibrating Sample Magnetometry (SQUID VSM). The films were found to be ferrimagnetic at room temperature and Field Cooling-Zero Field Cooling (FC-ZFC) studies indicate the presence of disorders.

  9. Optical Properties of Epitaxially Grown Silver Films

    NASA Astrophysics Data System (ADS)

    Wu, Yanwen; Zhang, Chendong; Zhang, Matt; Shih, Chih-Kang; Li, Xiaoqin

    2013-03-01

    One major obstacle in the advancing field of plasmonics is the loss in metals. A sizable contribution of this loss comes from grain boundaries and surface roughness introduced during thin film growth using conventional deposition methods. A novel epitaxial growth technique is used to produce silver (Ag) thin films free of such flaws. We investigate the optical properties-namely the dielectric optical constants-of these new epitaxial films in the bulk region and in the ultrathin film limit where quantum mechanical behaviors emerge due to energy quantization in the growth direction. The values for the dielectric optical constants are extracted from the spectral ellipsometry (SE) measurements over a wide range of optical frequencies. By using an adequate model of the sample structure and initial values of the fitting parameters (i.e. the real and imaginary parts of the optical constants), we can extract these measured values for the new Ag films. We have confirmed that in the bulk region, the optical constants converge with the well-known Johnson and Christy measurements. In the ultrathin film limit, however, we observed significant changes near the D-band transition likely due to a quantum well-like density of states. Equal contribution. Also affiliated with Department of Physics, The University of South Carolina, Columbia, SC 29208

  10. Coexistence of Low Damping and Strong Magnetoelastic Coupling in Epitaxial Spinel Ferrite Thin Films.

    PubMed

    Emori, Satoru; Gray, Benjamin A; Jeon, Hyung-Min; Peoples, Joseph; Schmitt, Maxwell; Mahalingam, Krishnamurthy; Hill, Madelyn; McConney, Michael E; Gray, Matthew T; Alaan, Urusa S; Bornstein, Alexander C; Shafer, Padraic; N'Diaye, Alpha T; Arenholz, Elke; Haugstad, Greg; Meng, Keng-Yuan; Yang, Fengyuan; Li, Dongyao; Mahat, Sushant; Cahill, David G; Dhagat, Pallavi; Jander, Albrecht; Sun, Nian X; Suzuki, Yuri; Howe, Brandon M

    2017-09-01

    Low-loss magnetization dynamics and strong magnetoelastic coupling are generally mutually exclusive properties due to opposing dependencies on spin-orbit interactions. So far, the lack of low-damping, magnetostrictive ferrite films has hindered the development of power-efficient magnetoelectric and acoustic spintronic devices. Here, magnetically soft epitaxial spinel NiZnAl-ferrite thin films with an unusually low Gilbert damping parameter (<3 × 10(-3) ), as well as strong magnetoelastic coupling evidenced by a giant strain-induced anisotropy field (≈1 T) and a sizable magnetostriction coefficient (≈10 ppm), are reported. This exceptional combination of low intrinsic damping and substantial magnetostriction arises from the cation chemistry of NiZnAl-ferrite. At the same time, the coherently strained film structure suppresses extrinsic damping, enables soft magnetic behavior, and generates large easy-plane magnetoelastic anisotropy. These findings provide a foundation for a new class of low-loss, magnetoelastic thin film materials that are promising for spin-mechanical devices. © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  11. Morphology in electrochemically grown conducting polymer films

    DOEpatents

    Rubinstein, Israel; Gottesfeld, Shimshon; Sabatani, Eyal

    1992-01-01

    A conducting polymer film with an improved space filling is formed on a metal electrode surface. A self-assembling monolayer is formed directly on the metal surface where the monolayer has a first functional group that binds to the metal surface and a second chemical group that forms a chemical bonding site for molecules forming the conducting polymer. The conducting polymer is then conventioonally deposited by electrochemical deposition. In one example, a conducting film of polyaniline is formed on a gold electrode surface with an intermediate monolayer of p-aminothiophenol.

  12. Morphology in electrochemically grown conducting polymer films

    DOEpatents

    Rubinstein, I.; Gottesfeld, S.; Sabatani, E.

    1992-04-28

    A conducting polymer film with an improved space filling is formed on a metal electrode surface. A self-assembling monolayer is formed directly on the metal surface where the monolayer has a first functional group that binds to the metal surface and a second chemical group that forms a chemical bonding site for molecules forming the conducting polymer. The conducting polymer is then conventionally deposited by electrochemical deposition. In one example, a conducting film of polyaniline is formed on a gold electrode surface with an intermediate monolayer of p-aminothiophenol. 2 figs.

  13. Deposition of nanostructured photocatalytic zinc ferrite films using solution precursor plasma spraying

    SciTech Connect

    Dom, Rekha; Sivakumar, G.; Hebalkar, Neha Y.; Joshi, Shrikant V.; Borse, Pramod H.

    2012-03-15

    Highlights: Black-Right-Pointing-Pointer Highly economic solution precursor route capable of producing films/coating even for mass scale production. Black-Right-Pointing-Pointer Pure spinel phase ZnFe{sub 2}O{sub 4} porous, immobilized films deposited in single step. Black-Right-Pointing-Pointer Parameter optimization yields access to nanostructuring in SPPS method. Black-Right-Pointing-Pointer The ecofriendly immobilized ferrite films were active under solar radiation. Black-Right-Pointing-Pointer Such magnetic system display advantage w.r.t. recyclability after photocatalyst extraction. -- Abstract: Deposition of pure spinel phase, photocatalytic zinc ferrite films on SS-304 substrates by solution precursor plasma spraying (SPPS) has been demonstrated for the first time. Deposition parameters such as precursor solution pH, concentration, film thickness, plasma power and gun-substrate distance were found to control physico-chemical properties of the film, with respect to their crystallinity, phase purity, and morphology. Alkaline precursor conditions (7 < pH {<=} 10) were found to favor oxide film formation. The nanostructured films produced under optimized conditions, with 500 mM solution at pH {approx} 8.0, yielded pure cubic phase ZnFe{sub 2}O{sub 4} film. Very high/low precursor concentrations yielded mixed phase, less adherent, and highly inhomogeneous thin films. Desired spinel phase was achieved in as-deposited condition under appropriately controlled spray conditions and exhibited a band gap of {approx}1.9 eV. The highly porous nature of the films favored its photocatalytic performance as indicated by methylene blue de-coloration under solar radiation. These immobilized films display good potential for visible light photocatalytic applications.

  14. Defect induced modification of structural, topographical and magnetic properties of zinc ferrite thin films by swift heavy ion irradiation

    NASA Astrophysics Data System (ADS)

    Raghavan, Lisha; Joy, P. A.; Vijaykumar, B. Varma; Ramanujan, R. V.; Anantharaman, M. R.

    2017-04-01

    Swift heavy ion irradiation provides unique ways to modify physical and chemical properties of materials. In ferrites, the magnetic properties can change significantly as a result of swift heavy ion irradiation. Zinc ferrite is an antiferromagnet with a Neel temperature of 10 K and exhibits anomalous magnetic properties in the nano regime. Ion irradiation can cause amorphisation of zinc ferrite thin films; thus the role of crystallinity on magnetic properties can be examined. The influence of surface topography in these thin films can also be studied. Zinc ferrite thin films, of thickness 320 nm, prepared by RF sputtering were irradiated with 100 MeV Ag ions. Structural characterization showed amorphisation and subsequent reduction in particle size. The change in magnetic properties due to irradiation was correlated with structural and topographical effects of ion irradiation. A rough estimation of ion track radius is done from the magnetic studies.

  15. The effect of AlN underlayer on c-axis orientation of barium ferrite thin films for perpendicular magnetic recording media

    NASA Astrophysics Data System (ADS)

    Kakizaki, Koichi; Watanabe, Hideaki; Hiratsuka, Nobuyuki

    2001-10-01

    The effect of AlN underlayer on c-axis orientation of barium ferrite thin films and their magnetic properties have been investigated. On the AlN underlayer with a thickness of 30 nm, barium ferrite film with a thickness of 50 nm was deposited at room temperature. As the deposited barium ferrite film was not crystallized, it was post-annealed at 800°C for 5 h in air. The c-axis of crystallized barium ferrite was oriented perpendicular to the film surface that was caused by the effect of the AlN underlayer.

  16. Al substituted Ba ferrite films with high coercivity and excellent squareness for low noise perpendicular recording layer

    NASA Astrophysics Data System (ADS)

    Feng, J.; Matsushita, N.; Watanabe, K.; Nakagawa, S.; Naoe, M.

    1999-04-01

    Al substituted BaM (Al-BaM) ferrite films with composition of BaAlxFe12-xO19 (x=0,1,2) were deposited using facing targets sputtering apparatus on SiOx/Si wafers with a Pt seed layer. A postannealing process is necessary to crystallize the films. It was confirmed that the substrate temperature Ts is also one of the important parameters for the magnetic properties of the postannealed films. Al-BaM ferrite films exhibit the Ts dependence of magnetic properties different from that of simple BaM ones. With increase of the Al content x in Al-BaM ferrite films, 4πMs decreased, while Hc and the anisotropy field HA increased. It was found that acicular shape grains formed more easily in Al-BaM ferrite films than in simple BaM ones. The squareness S⊥ increased largely by substitution of Al for Fe. The Al-BaM ferrite films with high Hc⊥ (˜3 kOe) and large S⊥(˜0.9) may be applicable as perpendicular magnetic recording layers with low noise level.

  17. Effect of annealing atmosphere on phase formation and electrical characteristics of bismuth ferrite thin films

    SciTech Connect

    Simoes, A.Z.; Riccardi, C.S.; Dos Santos, M.L.; Garcia, F. Gonzalez; Longo, E.; Varela, J.A.

    2009-08-05

    Bismuth ferrite thin films were deposited on Pt/Ti/SiO{sub 2}/Si substrates by a soft chemical method and spin-coating technique. The effect of annealing atmosphere (air, N{sub 2} and O{sub 2}) on the structure and electrical properties of the films are reported. X-ray diffraction analysis reveals that the film annealed in air atmosphere is a single-phase perovskite structure. The films annealed in air showed better crystallinity and the presence of a single BFO phase leading to lower leakage current density and superior ferroelectric hysteresis loops at room temperature. In this way, we reveal that BFO film crystallized in air atmosphere by the soft chemical method can be useful for practical applications, including nonvolatile digital memories, spintronics and data-storage media.

  18. Electromagneto-optical effects on local areas of a ferrite-garnet film

    NASA Astrophysics Data System (ADS)

    Koronovskyy, V. E.; Ryabchenko, S. M.; Kovalenko, V. F.

    2005-05-01

    The electromagneto-optical (EMO) effect from separate magnetic domains in the epitaxial films of yttrium-ferrite-garnet is investigated simultaneously with visual control of the film’s domain structure. The local EMO effect, both from single domain sites and from the sites with a domain wall is measured. These local effects are different from the EMO from the multidomain area of a film. It was revealed unexpectedly that a local value of the EMO effect for the domain magnetized along the applied magnetic field decreased drastically in the magnetization stage connected with vanishing of the domains with opposite sign of magnetization. In the homogeneously magnetized film, the EMO effect is practically absent. It is concluded that the electric field practically does not modify the film magnetization and the local EMO effect is connected with the influence of the electric field on the magnetic anisotropy parameter of the studied film.

  19. Ferrite Film Loaded Frequency Selective Metamaterials for Sub-GHz Applications

    PubMed Central

    Gao, Bo; Yuen, Matthew M. F.; Ye, Terry

    2016-01-01

    Electromagnetic metamaterials are constructed with sub-wavelength structures that exhibit particular electromagnetic properties under a certain frequency range. Because the form-factor of the substructures has to be comparable to the wavelength of the operating frequency, few papers have discussed the metamaterials under GHz frequency. In this paper, we developed an innovative method to reduce the resonant frequency of metamaterals. By integrating the meta-structures with ferrite materials of higher permeability, the cell size of the meta-structure can be scaled down. This paper describes the methodology, design, and development of low-profile GHz ferrite loaded metamaterials. A ferrite film with a permeability of 20 could reduce the resonant frequency of metamaterials by up to 50%. A prototype has been fabricated and the measurement data align well with the simulation results. Because of the lowered operational frequency, the proposed ferrite loaded metamaterials offer more flexibility for various sub-GHz microwave applications, such as cloaks, absorbers, and frequency selective surfaces. PMID:28774128

  20. Ferrite Film Loaded Frequency Selective Metamaterials for Sub-GHz Applications.

    PubMed

    Gao, Bo; Yuen, Matthew M F; Ye, Terry

    2016-12-13

    Electromagnetic metamaterials are constructed with sub-wavelength structures that exhibit particular electromagnetic properties under a certain frequency range. Because the form-factor of the substructures has to be comparable to the wavelength of the operating frequency, few papers have discussed the metamaterials under GHz frequency. In this paper, we developed an innovative method to reduce the resonant frequency of metamaterals. By integrating the meta-structures with ferrite materials of higher permeability, the cell size of the meta-structure can be scaled down. This paper describes the methodology, design, and development of low-profile GHz ferrite loaded metamaterials. A ferrite film with a permeability of 20 could reduce the resonant frequency of metamaterials by up to 50%. A prototype has been fabricated and the measurement data align well with the simulation results. Because of the lowered operational frequency, the proposed ferrite loaded metamaterials offer more flexibility for various sub-GHz microwave applications, such as cloaks, absorbers, and frequency selective surfaces.

  1. Magnetic Sensor for Detection of Ground Vehicles Based on Microwave Spin Wave Generation in Ferrite Films

    DTIC Science & Technology

    2006-11-01

    kPMHHkHf 042, ππ γ += , 2 where γ/2π = 2.8 MHz/Oe is the gyromagnetic ratio, M0 is the saturation magnetization of the ferromagnetic material, and...measured by the frequency meter. Using typical values for high-quality magnetic films of yttrium-iron garnet ( YIG ) 4πM0 = 1750 Oe, H0 = 100 Oe... MAGNETIC SENSOR FOR DETECTION OF GROUND VEHICLES BASED ON MICROWAVE SPIN WAVE GENERATION IN FERRITE FILMS A. Slavin*, and V. Tiberkevich

  2. Fluorination of epitaxial oxides: Creating ferrite and nickelate oxyfluoride films

    NASA Astrophysics Data System (ADS)

    May, Steven; Moon, Eun; Xie, Yujun; Keavney, David; Goebel, Justin; Laird, Eric; Li, Christopher

    2013-03-01

    In ABO3 perovskites, the physical properties are directly coupled to the nominal valence state of the B-site cation. In epitaxial thin films, the dominant strategy to control B-site valence is through the selection of a di- or trivalent cation on the A-site. However, this approach is limited, particularly when electron doping on the B-site is desired. Here we report a simple method for realizing oxyfluoride films, where the substitution of F for O is expected to reduce the B-site valence, providing a new means to tune electronic, optical and magnetic properties in thin films. Fluorination is achieved by spin coating an oxygen deficient film with poly(vinylidene fluoride). The film/polymer bilayer is then annealed, promoting the diffusion of F into the film. We have used this method to synthesize SrFeO3-δFδ and LaNiO3-δFδ (δ ? 0.5) films, as confirmed by x-ray photoemission spectroscopy and x-ray absorption spectroscopy. This work is supported by the U. S. Army Research Office under grant number W911NF-12-1-0132. Work at the Advanced Photon Source is supported by the U.S. Department of Energy (DOE), Office of Basic Energy Sciences under contract DE-AC02-06CH11357.

  3. Structure and conductivity of epitaxial thin films of barium ferrite and its hydrated form BaFeO2.5‑x+δ (OH)2x

    NASA Astrophysics Data System (ADS)

    Anitha Sukkurji, Parvathy; Molinari, Alan; Benes, Alexander; Loho, Christoph; Sai Kiran Chakravadhanula, Venkata; Garlapati, Suresh Kumar; Kruk, Robert; Clemens, Oliver

    2017-03-01

    Barium ferrite and its hydrated form (BaFeO2.5‑x+δ (OH)2x , BFO) is an interesting cathode material for protonic ceramic fuel cells (PCFC) due to its potential to be both, conducting for electrons and protons. We report on the fabrication of almost epitaxially grown thin films (22 nm) of barium ferrite BaFeO~2.5 (BFO) on Nb-doped SrTiO3 substrates via pulsed laser deposition (PLD), followed by treatment under inert, and subsequently wet inert atmospheres to induce water (respectively proton) incorporation. Microstructure, chemical composition and conducting properties are investigated for the BFO films and their hydrated forms, highlighting the influence of hydration on the conductivity characteristics between ~200–290 K. We find that water incorporation gives a strong enhancement of the conductivity to ~10‑9 S cm‑1 compared to argon annealed films, inducing electronic and protonic charge carriers at the same time. In comparison to bulk powders, proton conductivity is found to be strongly suppressed in such thin hydrated BFO films, pointing towards the influence of strain on the conductivity, which is evaluated based on a detailed investigation by high-resolution transmission electron microscopy.

  4. Structural and magnetic properties of NiZn and Zn ferrite thin films obtained by laser ablation deposition

    SciTech Connect

    Sorescu, Monica; Diamandescu, L.; Swaminathan, R.; McHenry, M.E.; Feder, M.

    2005-05-15

    Laser ablation deposition has been used to synthesize nanoscale ferrite structures. Our investigations were performed on NiZn and Zn ferrite films deposited on silicon(100) substrates. Films produced by laser ablation at room temperature were annealed at 550 deg. C for 1 h. Other films were deposited directly at a 550 deg. C substrate temperature without subsequent annealing. Complementary x-ray diffraction and superconducting quantum interference device magnetometry measurements helped identify the optimum laser ablation deposition conditions for obtaining the desired nanoferrite structures. From the hysteresis loops at 300 and 10 K we identified the paramagnetic or ferromagnetic behavior of the films. The zero field cooled-field cooled (ZFC-FC) magnetization, M(T), curves yielded the value of the blocking temperature in both NiZn and Zn ferrite systems.

  5. Magnetic domain structure in nanocrystalline Ni-Zn-Co spinel ferrite thin films using off-axis electron holography

    NASA Astrophysics Data System (ADS)

    Zhang, D.; Ray, N. M.; Petuskey, W. T.; Smith, D. J.; McCartney, M. R.

    2014-08-01

    We report a study of the magnetic domain structure of nanocrystalline thin films of nickel-zinc ferrite. The ferrite films were synthesized using aqueous spin-spray coating at low temperature (˜90 °C) and showed high complex permeability in the GHz range. Electron microscopy and microanalysis revealed that the films consisted of columnar grains with uniform chemical composition. Off-axis electron holography combined with magnetic force microscopy indicated a multi-grain domain structure with in-plane magnetization. The correlation between the magnetic domain morphology and crystal structure is briefly discussed.

  6. Magnetic domain structure in nanocrystalline Ni-Zn-Co spinel ferrite thin films using off-axis electron holography

    SciTech Connect

    Zhang, D.; Ray, N. M.; Petuskey, W. T.; Smith, D. J.; McCartney, M. R.

    2014-08-28

    We report a study of the magnetic domain structure of nanocrystalline thin films of nickel-zinc ferrite. The ferrite films were synthesized using aqueous spin-spray coating at low temperature (∼90 °C) and showed high complex permeability in the GHz range. Electron microscopy and microanalysis revealed that the films consisted of columnar grains with uniform chemical composition. Off-axis electron holography combined with magnetic force microscopy indicated a multi-grain domain structure with in-plane magnetization. The correlation between the magnetic domain morphology and crystal structure is briefly discussed.

  7. Electromagnetic Wave Shieding Effectiveness of Carbon Fiber Sheet Coated Ferrite Film by Microwave-Hydrothermal Process

    NASA Astrophysics Data System (ADS)

    Murakami, Ri Ichi; Yamamoto, Hidetoshi; Kim, Chan Kong; Yim, Cheol Mun; Kim, Yun Hae

    The developments of electromagnetic wave shielding materials are strongly required because the malfunction of electronic equipment, mobile phone and wireless LAN avoids. In this study, it was investigated that the electromagnetic shielding effectiveness of carbon fiber sheets were enhanced by the ferrite which was coated by the microwave hydrothermal process. For coated carbon fiber sheet, the effects of ferrite and lamination of carbon fiber textile on the electromagnetic wave shielding effectiveness were discussed. In the range of frequency (100 1 GHz), the electromagnetic wave shielding effectiveness was measured by using TEM-Cell. The electromagnetic wave shielding effectiveness was greater for the coated carbon fiber sheets than for the uncoated carbon fiber sheets. When the insulation film was located between two carbon fiber sheets, the electromagnetic wave shielding effectiveness increased.

  8. Hydrothermally grown nanostructured WO3 films and their electrochromic characteristics

    NASA Astrophysics Data System (ADS)

    Jiao, Zhihui; Sun, Xiao Wei; Wang, Jinmin; Ke, Lin; Demir, Hilmi Volkan

    2010-07-01

    We report the synthesis of nanostructured tungsten trioxide (WO3) films and their electrochromic characteristics. Plate-like monoclinic WO3 nanostructures were grown directly on fluorine-doped tin oxide glass substrates by a simple and low-cost crystal-seed-assisted hydrothermal method. The growth mechanism of the film is investigated. HRTEM analysis reveals the single crystalline quality of the WO3 nanostructure. The film exhibits tunable transmittance modulation under different voltages and repetitive cycling between the clear and blue states has no deleterious effect on its electrochromic performance after 3000 cycles. The electrochromic device composed of the WO3 film has high electrochromic stability, colour contrast and reasonable switching response with a colouration efficiency of 38.2 cm2 C-1 at 632.8 nm.

  9. Carbon films grown from plasma on III-V semiconductors

    NASA Technical Reports Server (NTRS)

    Pouch, J. J.; Warner, J. D.; Liu, D. C.

    1985-01-01

    Dielectric carbon films were grown on n- and p-type GaAs and InP substrates using plasmas generated at 30 KHz from gaseous hydrocarbons. The effect of gas source, flow rate, and power on film growth were investigated. Methane and n-butane gases were utilized. The flow rate and power ranged from 30 to 50 sccm and 25 to 300 W, respectively. AES measurements show only carbon to be present in the films. The relative Ar ion sputtering rate (3 KeV) of carbon depends on the ratio power/pressure. In addition, the degree of asymmetry associated with the carbon-semiconductor interface is approximately power-independent. SIMS spectra indicate different H-C bonding configurations to be present in the films. Band gaps as high as 3.05 eV are obtained from optical absorption studies.

  10. Solution grown PbS nanoparticle films [rapid communication

    NASA Astrophysics Data System (ADS)

    Joshi, Rakesh K.; Kanjilal, Aloke; Sehgal, H. K.

    2004-01-01

    Lead sulfide (PbS) nanoparticle films were chemically grown on glass, quartz and silicon substrates. Structure and size of PbS nanoparticles were characterized by X-ray diffraction and transmission electron microscopy (TEM), respectively. Large optical band gap has been observed in these films. The decreases in dc-conductivity, Hall mobility and carrier concentration with reducing grain size were also examined. Heterojunctions of p-PbS/n-Si were fabricated and photovoltaic effect was observed in these self-assembled heterojunctions.

  11. Experimental and Numerical Study on the Effect of ZDDP Films on Sticking During Hot Rolling of Ferritic Stainless Steel Strip

    NASA Astrophysics Data System (ADS)

    Hao, Liang; Jiang, Zhengyi; Wei, Dongbin; Gong, Dianyao; Cheng, Xiawei; Zhao, Jingwei; Luo, Suzhen; Jiang, Laizhu

    2016-10-01

    The aim of this study is to investigate the effect of zinc dialkyl dithio phosphate (ZDDP) films on sticking during hot rolling of a ferritic stainless steel strip. The surface characterization and crack propagation of the oxide scale are very important for understanding the mechanism of the sticking. The high-temperature oxidation of one typical ferritic stainless was conducted at 1373 K (1100 °C) for understanding its microstructure and surface morphology. Hot-rolling tests of a ferritic stainless steel strip show that no obvious cracks among the oxide scale were observed with the application of ZDDP. A finite element method model was constructed with taking into consideration different crack size ratios among the oxide scale, surface profile, and ZDDP films. The simulation results show that the width of the crack tends to be reduced with the introduction of ZDDP films, which is beneficial for improving sticking.

  12. Effects of additives on the preferred orientation of Mn-Zn ferrite thin films deposited by ion beam sputtering

    NASA Astrophysics Data System (ADS)

    Cho, Hae Seok; Kim, Hyeong Joon

    1995-03-01

    We investigated the effects of additives on the preferred orientation of the Mn-Zn ferrite thin films deposited on SiO2(1000 Å)/Si(100) at 350 °C by ion beam sputtering. A mosaic target, consisting of a single crystal (100) Mn-Zn ferrite with a metal strip on it, was employed as the target. The preferred orientation of the ferrite films was (hhh) for the target with or without Fe and Zn additives, and (h00) for Ti addition. In the case of Cu addition, a weak (311) orientation appeared with a strong (hhh) preferred orientation. The origin of the changes in the preferred orientation with different additives was discussed. The easy axis of magnetization, however, lay in the direction parallel to the film plane due to large shape anisotropy, irrespective of the preferred orientation.

  13. Polymetallic citric complexes as precursors for spray-pyrolysis deposition of thin ferrite films

    NASA Astrophysics Data System (ADS)

    Milanova, M.; Koleva, I.; Todorovska, R.; Zaharieva, J.; Кostadinov, M.; Todorovsky, D.

    2011-06-01

    Thin films of ferrites of the type M IIFe 2O 4 (M = Cu, Mg, Zn) are prepared by spray-pyrolysis using ethylene glycol solutions of mixed-metal citric complexes of the respective metals at substrate temperature between 350 °C and 450 °C and post-deposition annealing at 480-750 °C in air. Phase composition, crystal structure, morphology and adhesion of the obtained films (40-400 nm in thickness) are studied by X-ray diffraction, SEM, energy dispersive X-ray microanalysis and AFM. Single phase dense uniform films with grains from 30-100 nm (M = Cu, Mg) to 0.15-2 μm (M = Zn) are obtained.

  14. Tailoring the optical bandgap and magnetization of cobalt ferrite thin films through controlled zinc doping

    NASA Astrophysics Data System (ADS)

    Sharma, Deepanshu; Khare, Neeraj

    2016-08-01

    In this report, the tuning of the optical bandgap and saturation magnetization of cobalt ferrite (CFO) thin films through low doping of zinc (Zn) has been demonstrated. The Zn doped CFO thin films with doping concentrations (0 to 10%) have been synthesized by ultrasonic assisted chemical vapour deposition technique. The optical bandgap varies from 1.48 to 1.88 eV and saturation magnetization varies from 142 to 221 emu/cc with the increase in the doping concentration and this change in the optical and magnetic properties is attributed to the change in the relative population of the Co2+ at the tetrahedral and octahedral sites. Raman study confirms the decrease in the population of Co2+ at tetrahedral sites with controlled Zn doping in CFO thin films. A quantitative analysis has been presented to explain the observed variation in the optical bandgap and saturation magnetization.

  15. Role of vacancies in transport and magnetic properties of nickel ferrite thin films

    SciTech Connect

    Anjum, S.; Rumaiz, A.; Jaffari, G.H.; Rafique, M.S.; Sha, S.I.

    2010-06-15

    Nickel ferrite thin films were synthesized by pulsed laser deposition. It was determined that the monotonic increase in saturation magnetization and the non-monotonic increase in electrical conductivity depend on the oxygen partial pressure during the growth of the thin films. A substantial reduction in magnetization was found which ranged between 0.4% and 40% of the bulk value as the oxygen partial pressure increased from 0.2 x 10{sup -6} Torr to 500 mTorr during the deposition of the films. There was a three orders of magnitude increase in conductivity for the sample prepared under the most oxygen deficient environment (partial pressure of oxygen 0.2 x 10{sup -6} Torr). These variations in saturation magnetization and conductivity are described within the framework of cation/oxygen vacancies in an inverse spinel nickel ferrite structure. The changes in the electronic structure due to the presence of the vacancies were investigated using x-ray photoelectron spectroscopy, which confirmed the formation of lower valent Ni for the samples prepared in an oxygen deficient atmosphere.

  16. Enhancement of rotatable anisotropy in ferrite doped FeNi thin film with oblique sputtering

    NASA Astrophysics Data System (ADS)

    Zhou, Cai; Jiang, Changjun; Zhao, Zhong

    2015-07-01

    Rotatable anisotropy of stripe domain (SD) was investigated in a ferrite doped FeNi thin film with different oblique angles. Rotation of SD under an in-plane magnetic field was observed by magnetic force microscopy, suggesting the existence of rotatable anisotropy. A rotatable anisotropy field Hrot was derived from the fitting curves of the in-plane resonance field versus the angle between the orientation of easy axis and applied field. As the oblique angle increases, an increase of Hrot from 305 Oe to 468 Oe was observed and the perpendicular anisotropy increased as well, indicating a correlation between rotatable anisotropy and perpendicular anisotropy.

  17. Persistent conductive footprints of 109° domain walls in bismuth ferrite films

    SciTech Connect

    Stolichnov, I.; Iwanowska, M.; Colla, E.; Setter, N.; Ziegler, B.; Gaponenko, I.; Paruch, P.; Huijben, M.; Rijnders, G.

    2014-03-31

    Using conductive and piezoforce microscopy, we reveal a complex picture of electronic transport at weakly conductive 109° domain walls in bismuth ferrite films. Even once initial ferroelectric stripe domains are changed/erased, persistent conductive paths signal the original domain wall position. The conduction at such domain wall “footprints” is activated by domain movement and decays rapidly with time, but can be re-activated by opposite polarity voltage. The observed phenomena represent true leakage conduction rather than merely displacement currents. We propose a scenario of hopping transport in combination with thermionic injection over interfacial barriers controlled by the ferroelectric polarization.

  18. Growth and crystallographic feature-dependent characterization of spinel zinc ferrite thin films by RF sputtering.

    PubMed

    Liang, Yuan-Chang; Hsia, Hao-Yuan

    2013-12-19

    ZnFe2O4 (ZFO) thin films exhibiting varying crystallographic features ((222)-epitaxially, (400)-epitaxially, and randomly oriented films) were grown on various substrates by radio-frequency magnetron sputtering. The type of substrate used profoundly affected the surface topography of the resulting ZFO films. The surface of the ZFO (222) epilayer was dense and exhibited small rectangular surface grains; however, the ZFO (400) epilayer exhibited small grooves. The surface of the randomly oriented ZFO thin film exhibited distinct three-dimensional island-like grains that demonstrated considerable surface roughness. Magnetization-temperature curves revealed that the ZFO thin films exhibited a spin-glass transition temperature of approximately 40 K. The crystallographic orientation of the ZFO thin films strongly affected magnetic anisotropy. The ZFO (222) epitaxy exhibited the strongest magnetic anisotropy, whereas the randomly oriented ZFO thin film exhibited no clear magnetic anisotropy.

  19. Effect of thickness on magnetic and microwave properties of RF-sputtered Zn-ferrite thin films

    NASA Astrophysics Data System (ADS)

    Sahu, B. N.; Venkataramani, N.; Prasad, Shiva; Krishnan, R.

    2017-05-01

    Zinc ferrite thin films of varying thickness were deposited at ambient temperature using RF-magnetron sputtering. The films were annealed at temperatures in the range 250 °C to 650 °C in air for 2 hrs. The magnetization of the film was observed to depend on the average grain size and also on thickness of the film. It was found that thermal annealing reduces the peak to peak ferromagnetic resonance (FMR) line width. A low in-plane line width of 195 Oe and a line width of 170 Oe in perpendicular configuration was observed for a 240 nm thickness film annealed at TA=450 °C.

  20. Thermal and electrical transport properties of polyvinyl alcohol and bismuth ferrite nanocomposites film

    NASA Astrophysics Data System (ADS)

    Rana, Dhiraj Kumar; Kundu, Shovan Kumar; Basu, Soumen

    2017-05-01

    The pure phase Bismuth ferrite (BFO) nanomaterial calcined at 500°C for 2hr. is synthesized by sol-gel method. From the TEM micrograph analysis the average particle size of BFO is calculated as 37nm. The polyvinyl alcohol (PVA) and PVA-BFO (2wt%) composites films are synthesized by drop casting method. The thermal stability of the composites films is increased with adding BFO 2wt% in PVA matrix and which is observed by TGA curve analysis. The variation of real part of dielectric constant and the ac electrical conductivity with frequency range 20Hz to 1MHz at different temperature range from 30°C to 130°C is measured. The electrical transport properties shows the correlated barrier hopping (CBH) model and it is well fitted with the experimental data which is measured from the ac conductivity plot.

  1. Integration of microwave termination based on TaN thin films on ferrite substrates

    NASA Astrophysics Data System (ADS)

    Zhang, Dainan; Ji, Liang; Kolodzey, James

    2015-10-01

    Integration of microwave discrete devices such as isolators and circulators is highly desired for radar and communication platforms and in particular as components used in transmit and receive (T/R) modules. In those applications, Tantalum nitride (TaN) films are widely used as a surface mounted termination to improve the reliability and performance. In the current work, TaN thin films were directly deposited on polycrystalline ferrite substrate (Ni0.3Zn0.7Fe2O4) to be integrated with isolators or circulators. The deposition conditions were first optimized to obtain suitable sheet resistance and near zero temperature coefficients of resistance (TCR). Next a 50 Ω microwave termination was designed and fabricated using standard photolithography techniques. Broadband measurements show that the terminator has a low voltage standing wave ratio (VSWR) of less than 1.20 in the frequency range of DC-20 GHz. The measured resistance was between 48 and 54 Ω.

  2. Bismuth ferrite based thin films, nanofibers, and field effect transistor devices

    NASA Astrophysics Data System (ADS)

    Rivera-Beltran, Rut

    In this research an attempt has been made to explore bismuth ferrite thin films with low leakage current and nanofibers with high photoconductivity. Thin films were deposited with pulsed laser deposition (PLD) method. An attempt has been made to develop thin films under different deposition parameters with following target compositions: i) 0.6BiFeO3-0.4(Bi0.5 K0.5)TiO3 (BFO-BKT) and ii) bi-layered 0.88Bi 0.5Na0.5TiO3-0.08Bi0.5K0.5TiO 3-0.04BaTiO3/BiFeO3 (BNT-BKT-BT/BFO). BFO-BKT thin film shows suppressed leakage current by about four orders of magnitude which in turn improve the ferroelectric and dielectric properties of the films. The optimum remnant polarization is 19 muC.cm-2 at the oxygen partial pressure of 300 mtorr. The BNT-BKT-BT/BFO bi-layered thin films exhibited ferroelectric behavior as: Pr = 22.0 muC.cm-2, Ec = 100 kV.cm-1 and epsilonr = 140. The leakage current of bi-layered thin films have been reduced two orders of magnitude compare to un-doped bismuth ferrite. Bismuth ferrite nanofibers were developed by electrospinning technique and its electronic properties such as photoconductivity and field effect transistor performance were investigated extensively. Nanofibers were deposited by electrospinning of sol-gel solution on SiO2/Si substrate at driving voltage of 10 kV followed by heat treatment at 550 °C for 2 hours. The composition analysis through energy dispersive detector and electron energy loss spectroscopy revealed the heterogeneous nature of the composition with Bi rich and Fe deficient regions. X-ray photoelectron spectroscopy results confirmed the combination of Fe3+ and Fe2+ valence state in the fibers. The photoresponse result is almost hundred times higher for a fiber of 40 nm diameter compared to a fiber with 100 nm diameter. This effect is described by a size dependent surface recombination mechanism. A single and multiple BFO nanofibers field effect transistors devices were fabricated and characterized. Bismuth ferrite FET behaves

  3. Electron theory of perpendicular magnetic anisotropy of Co-ferrite thin films

    SciTech Connect

    Inoue, Jun-ichiro; Yanagihara, Hideto; Kita, Eiji; Niizeki, Tomohiko; Itoh, Hiroyoshi

    2014-02-15

    We develop an electron theory for the t{sub 2g} electrons of Co{sup 2+} ions to clarify the perpendicular magnetic anisotropy (PMA) mechanism of Co-ferrite thin films by considering the spin-orbit interaction (SOI) and crystal-field (CF) potentials induced by the local symmetry around the Co ions and the global tetragonal symmetry of the film. Uniaxial and in-plane MA constants K{sub u} and K{sub 1} at 0 K, respectively, are calculated for various values of SOI and CF. We show that reasonable parameter values explain the observed PMA and that the orbital moment for the in-plane magnetization reduces to nearly half of that of the out-of-plane magnetization.

  4. The effect of solution pH on the electrochemical performance of nanocrystalline metal ferrites MFe2O4 (M=Cu, Zn, and Ni) thin films

    NASA Astrophysics Data System (ADS)

    Elsayed, E. M.; Rashad, M. M.; Khalil, H. F. Y.; Ibrahim, I. A.; Hussein, M. R.; El-Sabbah, M. M. B.

    2016-04-01

    Nanocrystalline metal ferrite MFe2O4 (M=Cu, Zn, and Ni) thin films have been synthesized via electrodeposition-anodization process. Electrodeposited (M)Fe2 alloys were obtained from aqueous sulfate bath. The formed alloys were electrochemically oxidized (anodized) in aqueous (1 M KOH) solution, at room temperature, to the corresponding hydroxides. The parameters controlling the current efficiency of the electrodeposition of (M)Fe2 alloys such as the bath composition and the current density were studied and optimized. The anodized (M)Fe2 alloy films were annealed in air at 400 °C for 2 h. The results revealed the formation of three ferrite thin films were formed. The crystallite sizes of the produced films were in the range between 45 and 60 nm. The microstructure of the formed film was ferrite type dependent. The corrosion behavior of ferrite thin films in different pH solutions was investigated using open circuit potential (OCP) and potentiodynamic polarization measurements. The open circuit potential indicates that the initial potential E im of ZnFe2O4 thin films remained constant for a short time, then sharply increased in the less negative direction in acidic and alkaline medium compared with Ni and Cu ferrite films. The values of the corrosion current density I corr were higher for the ZnFe2O4 films at pH values of 1 and 12 compared with that of NiFe2O4 and CuFe2O4 which were higher only at pH value 1. The corrosion rate was very low for the three ferrite films when immersion in the neutral medium. The surface morphology recommended that Ni and Cu ferrite films were safely used in neutral and alkaline medium, whereas Zn ferrite film was only used in neutral atmospheres.

  5. Atomically flat nickel film grown on synthetic mica

    NASA Astrophysics Data System (ADS)

    Tanaka, Hiroyuki; Taniguchi, Masateru

    2016-07-01

    We have grown nickel heteroepitaxially on muscovite and synthetic mica in vacuo for use as substrates for scanning probe microscopy (SPM) and graphene formation. We have determined annealing conditions that could generate atomically flat surfaces (with rms surface roughness of less than 1 nm). Owing to accelerated degradation at temperatures above 600 °C, muscovite mica was unsuitable as a substrate at high growth temperatures. Thermally stable synthetic fluorophlogopite mica [KMg3(AlSi3O10)F2], on the other hand, was found to be stable at 800 °C and successfully employed for the formation of atomically flat films.

  6. Properties of Diamond Composite Films Grown on Iron Surfaces

    DTIC Science & Technology

    1991-01-22

    surface area is designed to be approximately 50 -75 % of the total substrate surface . Figure 2 depicts a cross sectional view of the diamond and 3...in OFFICE OF NAVAL RESEARCH Grant # N0001489Jl848 R&T Code 413n003 Technical Report No. 2 Properties of Diamond Composite Films grown on Iron... Surfaces bv T.P. Ona ano k.P.H. Chanq Preoared tor DIuoiicatlon in the Applied Physics Letters D TIC 0% ELECTE Northwestern University FEBO41991 Department

  7. Perpendicularly oriented barium ferrite thin films with low microwave loss, prepared by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Da-Ming, Chen; Yuan-Xun, Li; Li-Kun, Han; Chao, Long; Huai-Wu, Zhang

    2016-06-01

    Barium ferrite (BaM) thin films are deposited on platinum coated silicon wafers by pulsed laser deposition (PLD). The effects of deposition substrate temperature on the microstructure, magnetic and microwave properties of BaM thin films are investigated in detail. It is found that microstructure, magnetic and microwave properties of BaM thin film are very sensitive to deposition substrate temperature, and excellent BaM thin film is obtained when deposition temperature is 910 °C and oxygen pressure is 300 mTorr (1 Torr = 1.3332 × 102 Pa). X-ray diffraction patterns and atomic force microscopy images show that the best thin film has perpendicular orientation and hexagonal morphology, and the crystallographic alignment degree can be calculated to be 0.94. Hysteresis loops reveal that the squareness ratio (M r/M s) is as high as 0.93, the saturated magnetization is 4004 Gs (1 Gs = 104 T), and the anisotropy field is 16.5 kOe (1 Oe = 79.5775 A·m-1). Ferromagnetic resonance measurements reveal that the gyromagnetic ratio is 2.8 GHz/kOe, and the ferromagnetic resonance linewith is 108 Oe at 50 GHz, which means that this thin film has low microwave loss. These properties make the BaM thin films have potential applications in microwave devices. Project supported by the Open Foundation of State Key Laboratory of Electronic Thin Films and Integrated Devices (Grant No. KFJJ201506), the Scientific Research Starting Foundation of Hainan University (Grant No. kyqd1539), and the Natural Science Foundation of Hainan Province (Grant No. 20165187).

  8. Superconducting YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} thin films on polycrystalline ferrite for magnetically tunable microwave components

    SciTech Connect

    Jia, Q.X.; Findikoglu, A.T.; Arendt, P.; Foltyn, S.R.; Roper, J.M.; Groves, J.R.; Coulter, J.Y.; Li, Y.Q.; Dionne, G.F.

    1998-04-01

    Superconducting YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} (YBCO) thin films with a surface resistance of 0.86 m{Omega} at 10 GHz and 76 K have been grown on polycrystalline ferrite yttrium iron garnet (YIG) substrates. The chemical and structural mismatches between YBCO and YIG are solved by using a double buffer layer of biaxially oriented yttria-stabilized zirconia (YSZ) and CeO{sub 2}, where YSZ is deposited by an ion-beam-assisted-deposition technique. The YBCO films are {ital c} axis oriented with an in-plane mosaic spread [full width at half maximum of an x-ray {phi}-scan on (103) reflection] of less than 8{degree}. The films have a superconductive transition temperature above 88 K with a transition width less than 0.3 K, giving a critical current density above 10{sup 6}A/cm{sup 2} in self field at 75 K. At 75 K in an external magnetic field of 1 T perpendicular to the film surface, the films maintain a critical current density over 2{times}10{sup 5}A/cm{sup 2}. {copyright} {ital 1998 American Institute of Physics.}

  9. Exchange bias in zinc ferrite-FeNiMoB based metallic glass composite thin films

    SciTech Connect

    R, Lisha; P, Geetha; B, Aravind P.; Anantharaman, M. R.; T, Hysen; Ojha, S.; Avasthi, D. K.; Ramanujan, R. V.

    2015-06-24

    The Exchange bias phenomenon and methods to manipulate the bias field in a controlled manner are thrust areas in magnetism due to its sophisticated theoretical concepts as well as advanced technological utility in the field of spintronics. The Exchange bias effect is observed as a result of ferromagnetic-antiferromagnetic (FM-AFM) exchange interaction, usually observed as a loop shift on field cooling below the Neel temperature of AFM. In the present study, we have chosen zinc ferrite which is a well known antiferromagnet, and FeNiMoB based metallic glass as the ferromagnet. The films were prepared by RF sputtering technique. The thickness and composition was obtained by RBS. The magnetic studies using SQUID VSM indicate exchange bias effect in the system. The effect of thermal annealing on exchange bias effect was studied. The observed exchange bias in the zinc ferrite-FeNiMoB system is not due to FM-AFM coupling but due to spin glass-ferromagnetic interaction.

  10. Exchange bias in zinc ferrite-FeNiMoB based metallic glass composite thin films

    NASA Astrophysics Data System (ADS)

    R, Lisha; T, Hysen; P, Geetha; B, Aravind P.; Ojha, S.; Avasthi, D. K.; Ramanujan, R. V.; Anantharaman, M. R.

    2015-06-01

    The Exchange bias phenomenon and methods to manipulate the bias field in a controlled manner are thrust areas in magnetism due to its sophisticated theoretical concepts as well as advanced technological utility in the field of spintronics. The Exchange bias effect is observed as a result of ferromagnetic-antiferromagnetic (FM-AFM) exchange interaction, usually observed as a loop shift on field cooling below the Neel temperature of AFM. In the present study, we have chosen zinc ferrite which is a well known antiferromagnet, and FeNiMoB based metallic glass as the ferromagnet. The films were prepared by RF sputtering technique. The thickness and composition was obtained by RBS. The magnetic studies using SQUID VSM indicate exchange bias effect in the system. The effect of thermal annealing on exchange bias effect was studied. The observed exchange bias in the zinc ferrite-FeNiMoB system is not due to FM-AFM coupling but due to spin glass-ferromagnetic interaction.

  11. Influence of Sn4+ on Structural and DC Electrical Resistivity of Ni-Zn Ferrite Thick Films

    NASA Astrophysics Data System (ADS)

    Dalawai, S. P.; Shinde, T. J.; Gadkari, A. B.; Tarwal, N. L.; Jang, J. H.; Vasambekar, P. N.

    2017-03-01

    Among the soft ferrites, Ni-Zn ferrite is one of the most versatile ceramic materials because of their important electrical and magnetic properties. These properties were improved by substituting Sn4+ in Ni-Zn ferrites with chemical composition of Ni x Zn1+ y- x Fe2-2 y Sn y O4 ( x = 0, 0.2, 0.4, 0.6, 0.8, 1.0; y = 0.1, 0.2). To achieve homogenous ferrite powder at lower sintering temperature and smaller duration in nano-size form, the oxalate co-precipitation method was preferred as compared to other physical and chemical methods. Using this powder, ferrite thick films (FTFs) were prepared by the screen printing technique because of its low cost and easy use. To study structural behavior, the FTFs were characterized by different techniques. The x-ray diffraction and thermo-gravimetric and differential thermal analysis studies show the formation of cubic spinel structure and ferrite phase formation, respectively. There is no remarkable trend observed in lattice constants for the Sn4+ ( y = 0.1)- and Sn4+ ( y = 0.2)-substituted Ni-Zn ferrites. The bond lengths as well as ionic radii on the A-site of Ni-Zn-Sn ferrites were found to decrease with increasing nickel content. The bond length and ionic radii on the B-sites remained almost constant for Sn4+ ( y = 0.1, 0.2)-substituted Ni-Zn ferrites. The energy dispersive x-ray analysis confirms the elemental analysis of FTFs. The Fourier transform infrared spectra show two major absorption bands near 400 cm-1 and 600 cm-1 corresponding to octahedral and tetrahedral sites, respectively, which also confirms the formation of the ferrites. The field emission scanning electron microscopy images shows that the particles are highly porous in nature and located in loosely packed agglomerates. The average particle size of the FTFs lies in the range 20-60 nm. Direct current (DC) resistivity of Ni-Zn-Sn FTFs shows the semiconductor nature. The DC resistivity of Ni-Zn-Sn0.2FTFs is lower than Ni-Zn-Sn0.1 FTFs. The DC resistivity is

  12. Influence of Sn4+ on Structural and DC Electrical Resistivity of Ni-Zn Ferrite Thick Films

    NASA Astrophysics Data System (ADS)

    Dalawai, S. P.; Shinde, T. J.; Gadkari, A. B.; Tarwal, N. L.; Jang, J. H.; Vasambekar, P. N.

    2016-12-01

    Among the soft ferrites, Ni-Zn ferrite is one of the most versatile ceramic materials because of their important electrical and magnetic properties. These properties were improved by substituting Sn4+ in Ni-Zn ferrites with chemical composition of Ni x Zn1+y-x Fe2-2y Sn y O4 (x = 0, 0.2, 0.4, 0.6, 0.8, 1.0; y = 0.1, 0.2). To achieve homogenous ferrite powder at lower sintering temperature and smaller duration in nano-size form, the oxalate co-precipitation method was preferred as compared to other physical and chemical methods. Using this powder, ferrite thick films (FTFs) were prepared by the screen printing technique because of its low cost and easy use. To study structural behavior, the FTFs were characterized by different techniques. The x-ray diffraction and thermo-gravimetric and differential thermal analysis studies show the formation of cubic spinel structure and ferrite phase formation, respectively. There is no remarkable trend observed in lattice constants for the Sn4+ (y = 0.1)- and Sn4+ (y = 0.2)-substituted Ni-Zn ferrites. The bond lengths as well as ionic radii on the A-site of Ni-Zn-Sn ferrites were found to decrease with increasing nickel content. The bond length and ionic radii on the B-sites remained almost constant for Sn4+ (y = 0.1, 0.2)-substituted Ni-Zn ferrites. The energy dispersive x-ray analysis confirms the elemental analysis of FTFs. The Fourier transform infrared spectra show two major absorption bands near 400 cm-1 and 600 cm-1 corresponding to octahedral and tetrahedral sites, respectively, which also confirms the formation of the ferrites. The field emission scanning electron microscopy images shows that the particles are highly porous in nature and located in loosely packed agglomerates. The average particle size of the FTFs lies in the range 20-60 nm. Direct current (DC) resistivity of Ni-Zn-Sn FTFs shows the semiconductor nature. The DC resistivity of Ni-Zn-Sn0.2FTFs is lower than Ni-Zn-Sn0.1 FTFs. The DC resistivity is found to

  13. Crystal structure and magnetic properties of Pb substituted Ba-ferrite sputtered films for perpendicular magnetic recording media (abstract)

    NASA Astrophysics Data System (ADS)

    Morisako, Akimitsu; Matsumoto, Mitsunori; Naoe, Masahiko

    1993-05-01

    Ba-ferrite (BaM) sputtered films are suitable for a high density perpendicular recording medium.1 There were some problems to be solved in preparing BaM films. One of the most important problems is that a high substrate temperature Ts was necessary. Ts for preparing BaM films with c-axis dispersion angle Δθ50 as small as 2°-3° is about 620 °C and a high Ts limits the selection of substrate material. In this paper, Pb substituted BaM[(BaṡPb)M] films were prepared by dc magnetron sputtering and their crystal structure and magnetic properties were studied. The substrate is a thermally oxidized silicon wafer. The target is a sintered ferrite disk (8 cm diameter) with stoichiometric composition of BaM and Pb content was controlled by the numbers of Pb chips on this disk. Argon and oxygen gas were introduced into a chamber and discharge gas pressure was set at 2 mTorr. Partial oxygen gas pressure was 0.01 mTorr and an applied power was 50 W. The thickness of (BaṡPb)M films was about 1500 Å. The films prepared at Ts below 300 °C were amorphous and those prepared at Ts ranging from 300 to 400 °C consisted of spinel-like phase. Saturation magnetization Ms of these films was almost zero. The films prepared at Ts above 400 °C consisted of both hexagonal and spinel-like ferrites.2 Intensity of diffraction lines from hexagonal ferrite became strong as Ts was elevated and those for hexagonal ferrite were only from c-plane such as (004), (006), (008), (0010), (0012), and (0014). Usually, the lines from the (004), (0010), and (0012) planes cannot be observed in bulk BaM. This implies that the c axis is well oriented perpendicularly to the film plane. (Ba/Pb)M films prepared at Ts about 520 °C possess Δθ50 of about 1°, Hc⊥ of 1.0 kOe, and Ms of about 250 emu/cc.

  14. Spin-spray deposited NiZn-Ferrite films exhibiting μr' > 50 at GHz range

    NASA Astrophysics Data System (ADS)

    Obi, Ogheneyunume; Liu, Ming; Lou, Jing; Stoute, Stephen; Xing, Xing; Sun, Nian X.; Warzywoda, Juliusz; Sacco, Albert; Oates, Daniel E.; Dionne, Gerald F.

    2011-04-01

    Ni0.27ZnxFe2.73-xO4 (with x = 0.03-0.1) thin films with high real permeability μr' in the GHz range were fabricated by the spin spray process onto glass substrates in the presence of an external magnetic field of 360 Oe. These films exhibit high permeabilities that exceeded the Snoek limit for bulk NiZn-ferrite films and those previously reported for spin spray deposited ferrites. The NiZn-ferrite film with x = 0.06 is low in magnetic losses, having tanδm (μr″/μr') ˜ 0.027 from 1 to 1.5 GHz, and a high ferromagnetic resonance (FMR) frequency of 2.7 GHz, while the x = 0.1 film exhibited a high μr' of ˜50 and μr″ > 50 at 1 GHz. These properties are ideal for microwave applications such as antennas, inductors and electromagnetic interference (EMI) suppression in the GHz range.

  15. Epitaxial Garnets and Hexagonal Ferrites.

    DTIC Science & Technology

    1983-12-01

    Ferrites Lithium Ferrite Magnetostatic Wave Garnets Epitaxy Yttrium Iron Garnet Liquid Phase Epitaxy Hexagonal Ferrite Microwave Signal Processing...epitaxial ferrit ( materials for use in microwave and millirreter-wave signal processing devices. The major emphasis has been on multiple layer...overall objective of this research is to develop epitaxial single crystal ferrite films suitable for microwave and millimeter-wave signal processing at

  16. Structure and Morphology of Phthalocyanine Films Grown in Electrical Fields by Vapor Deposition

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Banks, C. E.; Frazier, D. O.; Penn, B.; Abdeldayem, H.; Hicks, R.; Burns, H. D.; Thompson, G. W.

    1999-01-01

    Phthalocyanine (Pc) films have been synthesized by vapor deposition on quartz substrates, some of which were coated with a very thin gold film before depositing Pc films. Electrical fields up to 6200 V/cm between a mech electrode and the substrate are introduced during film growth. These films have been characterized by x-ray diffraction and scanning electron microscopy. The molecular orientations and surface morphology of Pc films were changed under the electrical fields. The surface of these films grown without electrical field shows whisk-like morphology. When films are deposited under an electrical field, a dense film with flat surface is obtained.

  17. Magnetic and transport properties of epitaxial thin film MgFe2O4 grown on MgO (100) by molecular beam epitaxy.

    PubMed

    Wu, Han-Chun; Mauit, Ozhet; Coileáin, Cormac Ó; Syrlybekov, Askar; Khalid, Abbas; Mouti, Anas; Abid, Mourad; Zhang, Hong-Zhou; Abid, Mohamed; Shvets, Igor V

    2014-11-12

    Magnesium ferrite is a very important magnetic material due to its interesting magnetic and electrical properties and its chemical and thermal stability. Here we report on the magnetic and transport properties of epitaxial MgFe2O4 thin films grown on MgO (001) by molecular beam epitaxy. The structural properties and chemical composition of the MgFe2O4 films were characterized by X-Ray diffraction and X-Ray photoelectron spectroscopy, respectively. The nonsaturation of the magnetization in high magnetic fields observed for M (H) measurements and the linear negative magnetoresistance (MR) curves indicate the presence of anti-phase boundaries (APBs) in MgFe2O4. The presence of APBs was confirmed by transmission electron microscopy. Moreover, post annealing decreases the resistance and enhances the MR of the film, suggesting migration of the APBs. Our results may be valuable for the application of MgFe2O4 in spintronics.

  18. Direct evidence for the spin cycloid in strained nanoscale bismuth ferrite thin films

    PubMed Central

    Bertinshaw, Joel; Maran, Ronald; Callori, Sara J.; Ramesh, Vidya; Cheung, Jeffery; Danilkin, Sergey A.; Lee, Wai Tung; Hu, Songbai; Seidel, Jan; Valanoor, Nagarajan; Ulrich, Clemens

    2016-01-01

    Magnonic devices that utilize electric control of spin waves mediated by complex spin textures are an emerging direction in spintronics research. Room-temperature multiferroic materials, such as bismuth ferrite (BiFeO3), would be ideal candidates for this purpose. To realize magnonic devices, a robust long-range spin cycloid with well-known direction is desired, since it is a prerequisite for the magnetoelectric coupling. Despite extensive investigation, the stabilization of a large-scale uniform spin cycloid in nanoscale (100 nm) thin BiFeO3 films has not been accomplished. Here, we demonstrate cycloidal spin order in 100 nm BiFeO3 thin films through the careful choice of crystallographic orientation, and control of the electrostatic and strain boundary conditions. Neutron diffraction, in conjunction with X-ray diffraction, reveals an incommensurate spin cycloid with a unique [11] propagation direction. While this direction is different from bulk BiFeO3, the cycloid length and Néel temperature remain equivalent to bulk at room temperature. PMID:27585637

  19. Analysis of the broadband chaotic spin-wave excitations in an active ring oscillator based on a metalized ferrite film

    NASA Astrophysics Data System (ADS)

    Kondrashov, A. V.; Ustinov, A. B.; Kalinikos, B. A.; Demokritov, S. O.

    2016-11-01

    This paper reports the first experimental study of broadband chaotic nonlinear spin- wave excitations which is formed through development of four-wave parametric processes in active ring oscillator based on metallized ferrite film. We find that an increase in the oscillation power leads to Hopf bifurcations sequence. Monochromatic, periodic quasi-periodic and chaotic excitations are observed. Spectra of the chaotic excitations consist of series of chaotic bands separated well in frequency. Parameters of the chaotic attractors are discussed.

  20. The magnetic properties of plasma-sprayed thick-film manganese zinc ferrite (MZF) and nickel iron alloy (Permalloy) composites

    SciTech Connect

    Liang, S.; Gambino, R. J.; Sampath, S.; Raja, M. M.

    2006-04-15

    MnZn ferrite/Permalloy composites have potential in high frequency magnetic applications and can be made into thick-film devices by air plasma spray. The as-sprayed composites have lower saturation magnetization than the starting powder. After annealing below 600 deg. C, the magnetic properties and electrical resistivity improve significantly. The changes in magnetic and electrical properties were correlated to structural changes and studied by x-ray-diffraction analysis, vibrating-sample magnetometer measurements, and microstructural analysis.

  1. Fabrication of a Common-mode Noise Filter for Balanced-mode Signal Transmission using Mn-Zn Ferrite Particle/Polyimide Composite Thick Film

    NASA Astrophysics Data System (ADS)

    Sato, Toshiro; Kokai, Takahiro; Moroishi, Masashi; Yamasawa, Kiyohito; Sakuma, Toshiyuki; Karasawa, Hiroki; Hirasawa, Koichi

    To develop a common-mode noise filter for balanced-mode digital signal interfaces such as USB ver. 2 and IEEE 1394, a Mn-Zn ferrite/Polyimide composite thick film was fabricated and applied to the filter device. The polycrystalline Mn-Zn ferrite powder and polyimide precursor liquid solution were used as the starting materials for the composite thick film. The composite film had a large imaginary part of complex permeability at high frequencies over 1GHz, and high permittivity. The common-mode noise filter using the composite film exhibited the common-mode suppression of over 10dB in the frequency range over 1GHz.

  2. Epitaxial Lift-Off of Centimeter-Scaled Spinel Ferrite Oxide Thin Films for Flexible Electronics.

    PubMed

    Shen, Lvkang; Wu, Liang; Sheng, Quan; Ma, Chunrui; Zhang, Yong; Lu, Lu; Ma, Ji; Ma, Jing; Bian, Jihong; Yang, Yaodong; Chen, Aiping; Lu, Xiaoli; Liu, Ming; Wang, Hong; Jia, Chun-Lin

    2017-09-01

    Mechanical flexibility of electronic devices has attracted much attention from research due to the great demand in practical applications and rich commercial value. Integration of functional oxide materials in flexible polymer materials has proven an effective way to achieve flexibility of functional electronic devices. However, the chemical and mechanical incompatibilities at the interfaces of dissimilar materials make it still a big challenge to synthesize high-quality single-crystalline oxide thin film directly on flexible polymer substrates. This study reports an improved method that is employed to successfully transfer a centimeter-scaled single-crystalline LiFe5 O8 thin film on polyimide substrate. Structural characterizations show that the transferred films have essentially no difference in comparison with the as-grown films with respect to the microstructure. In particular, the transferred LiFe5 O8 films exhibit excellent magnetic properties under various mechanical bending statuses and show excellent fatigue properties during the bending cycle tests. These results demonstrate that the improved transfer method provides an effective way to compose single-crystalline functional oxide thin films onto flexible substrates for applications in flexible and wearable electronics. © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  3. Fabrication of a Zn-Ferrite Thick Film Planar Power Inductor for DC-DC Converter LSI Package

    NASA Astrophysics Data System (ADS)

    Okazaki, Shinya; Takeuchi, Asako; Takeshima, Akihiro; Sonehara, Makoto; Sato, Toshiro; Matsushita, Nobuhiro

    In order to realize the “POL (Point of Load)” dc-dc converter for LSIs, a Zn-ferrite thick film planar power inductor embedded in LSI package has been fabricated and evaluated in this study. 10 μm thick spin-sprayed Zn ferrite film with a high saturation magnetization of 0.57 T was introduced to the magnetic core for planer power inductor consisting of a 20 μm thick, 650 μm square, 2-turn inner copper spiral coil sandwiched by top and bottom magnetic core. Zn ferrite film had a natural resonance frequency of 500 MHz and a static relative permeability of 80. The planar power inductor with a footprint of 850×850 μm exhibited a 10 nH inductance and a quality factor of 20 at 100 MHz. The degradation of inductance owing to the superimposed dc current of 2A was 17%. The planar power inductor will be applied to low-voltage converter with hundreds megahertz switching operation in the future.

  4. Investigation of Hexagonal Ferrite Film Growth Techniques for Millimeter-Wave Systems Applications.

    DTIC Science & Technology

    1987-03-15

    hexagonal ferrite compounds. The approach was twofold: to synthesize lattice-matched substrate materials and to explore epitaxial growth methods which...poly-crystal garnet or spinel ferrites find widespread use as tunable microwave filters and resonators in applica- tions ranging from test equipment...REFERENCES 1. W. H. von Aulock, ed., Handbook of Microwave Ferrite Materials, Academic Press, NY. 2. R. 0. Savage et al., J. App1. Phys., 36: 873 (1965

  5. The growth of strontium titanate and lutetium ferrite thin films by molecular-beam epitaxy

    NASA Astrophysics Data System (ADS)

    Brooks, Charles M.

    Included in this work is a range of studies on films of homoeptaxial and heteroepitaxial films of SrTiO3 and the first reported phase-pure films of LuFe2O4. We report the structural properties of homoepitaxial (100) SrTiO3 films grown by reactive molecular-beam epitaxy (MBE). The lattice spacing and x-ray diffraction (XRD) rocking curves of stoichiometric MBEgrown SrTiO3 films are indistinguishable from the underlying SrTiO3 substrates. The effect of off-stoichiometry for both strontium-rich and strontium-poor compositions results in lattice expansion with significant changes to the shuttered reflection high-energy electron diffraction oscillations, XRD, film microstructure, and thermal conductivity. Up to an 80% reduction in Sr(1+x)TiO3 film thermal conductivity is measured for x = -0.1 to 0.5. Significant reduction, from 11.5 to ˜2 W˙m-1K-1, occurs through the formation of Ruddlesden-Popper planar faults. The ability to deposit films with a reduction in thermal conductivity is applicable to thermal barrier coatings and thermoelectrics. Scanning transmission electron microscopy is used to examine the formation of Ruddlesden-Popper planar faults in films with strontium excess. We also show that the band gap of SrTiO3 can be altered by >10% (0.3 eV) by using experimentally realizable biaxial strains providing a new means to accomplish band gap engineering of SrTiO3 and related perovskites. Such band gap manipulation is relevant to applications in solar cells water splitting, transparent conducting oxides, superconductivity, two-dimensional electron liquids, and other emerging oxide electronics. This work also presents the adsorption-controlled growth of single-phase (0001)-oriented epitaxial films of charge ordered multiferroic, LuFe2O4, on (111) MgAl2O4, (111) MgO, and (0001) 6H-SiC substrates in an iron-rich environment at pressures and temperatures where excess iron desorbs from the film surface during growth. Scanning transmission electron microscopy reveals

  6. Oscillator strength and dispersive energy of dipoles in ferrite thin film

    NASA Astrophysics Data System (ADS)

    Abdellatif, M. H.; El-Komy, G. M.; Azab, A. A.; Moustafa, A. M.

    2017-07-01

    A thin film of Gd3+ doped Mn-Cr ferrite of the chemical formula MnCr0.5Gd0.02Fe1.48O4 was prepared by pulsed laser deposition from the bulk sample at room temperature. The optical absorption, transmission and reflection spectra were measured and discussed in the wavelength range from 300 to 2500 nm. The optical parameters were calculated following the single oscillator model. The optical band gap was found to be 2.75 eV, the dispersive energy of the electric dipoles was estimated using Wemple-Di Domenico relation to be 6.395 eV, while the oscillating energy of the dipole is found to be 4.997 eV. The optical dielectric constant was determined to be 3.886. The reported values could be taken as an indication to the crystal field deformation due to the large size Gd3+ ion in compensation to the physical deformation of the spinel structure.

  7. Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films

    SciTech Connect

    Krishnan, P.S. Sanakara R.; Aguiar, Jeffery A.; Ramasse, Q. M.; Kepaptsoglou, D. M.; Liang, W. I.; Chu, Y. H.; Browning, Nigel D.; Munroe, Paul R.; Nagarajan, Valanoor

    2015-01-01

    Strain engineering of epitaxial ferroelectrics has emerged as a powerful method to tailor the electromechanical response of these materials, although the effect of strain at the atomic scale and the interplay between lattice displacements and electronic structure changes are not yet fully understood. Here, using a combination of scanning transmission electron microscopy (STEM) and density functional theory (DFT), we systematically probe the role of epitaxial strain in mixed phase bismuth ferrite thin films. Electron energy loss O K and Fe L2,3 edge spectra acquired across the rhombohedral (R)-tetragonal (T) phase boundary reveal progressive, and systematic changes, in electronic structure going from one phase to the other. The comparison of the acquired spectra, with theoretical simulations using DFT, suggests a breakage in the structural symmetry across the boundary due to the simultaneous presence of increasing epitaxial strain and off- axial symmetry in the T phase. This implies that the imposed epitaxial strain plays a significant role in not only changing the crystal-field geometry, but also the bonding environment surrounding the central iron cation at the interface thus providing new insights and a possible link to understand how the imposed strain could perturb magnetic ordering in the T phase BFO.

  8. Photoresponse properties of BaSi2 film grown on Si (100) by vacuum evaporation

    NASA Astrophysics Data System (ADS)

    Thi Trinh, Cham; Nakagawa, Yoshihiko; Hara, Kosuke O.; Takabe, Ryota; Suemasu, Takashi; Usami, Noritaka

    2016-07-01

    We have succeeded in the observation of high photoresponsivity of orthorhombic BaSi2 film grown on crystalline Si by a vacuum evaporation method, raising the prospect of its promising application in high-efficiency thin-film solar cells. Photocurrent was observed at photon energies larger than 1.28 eV, which corresponds to the band gap of evaporated BaSi2 film, indicating that the photoresponsivity originates from the BaSi2 film. The effect of the substrate temperature on the film’s properties was also investigated. The films grown at a substrate temperature larger than 500 °C are single-phase polycrystalline BaSi2 films, while those grown at a substrate temperature of 400 °C is a mixture of phases. We confirmed that undoped evaporated BaSi2 films are an n-type material with high carrier concentration. High carrier lifetime of 4.8 and 2.7 μs can be found for the films grown at 500 °C and 400 °C, respectively. BaSi2 film grown at a substrate temperature of 500 °C, which is crack-free and single-phase, shows the best photoresponsivity. The maximum value of photocurrent was obtained at photon energy of 1.9 eV, corresponding to an external quantum efficiency of 22% under reverse applied voltage of 2 V.

  9. Evaluation of humidity sensing properties of TMBHPET thin film embedded with spinel cobalt ferrite nanoparticles

    NASA Astrophysics Data System (ADS)

    Zafar, Qayyum; Azmer, Mohamad Izzat; Al-Sehemi, Abdullah G.; Al-Assiri, Mohammad S.; Kalam, Abul; Sulaiman, Khaulah

    2016-07-01

    In this study, we report the enhanced sensing parameters of previously reported TMBHPET-based humidity sensor. Significant improved sensing performance has been demonstrated by coupling of TMBHPET moisture sensing thin film with cobalt ferrite nanoparticles (synthesized by eco-benign ultrasonic method). The mean size of CoFe2O4 nanoparticles has been estimated to be 6.5 nm. It is assumed that the thin film of organic-ceramic hybrid matrix (TMBHPET:CoFe2O4) is a potential candidate for humidity sensing utility by virtue of its high specific surface area and porous surface morphology (as evident from TEM, FESEM, and AFM images). The hybrid suspension has been drop-cast onto the glass substrate with preliminary deposited coplanar aluminum electrodes separated by 40 µm distance. The influence of humidity on the capacitance of the hybrid humidity sensor (Al/TMBHPET:CoFe2O4/Al) has been investigated at three different frequencies of the AC applied voltage ( V rms 1 V): 100 Hz, 1 kHz, and 10 kHz. It has been observed that at 100 Hz, under a humidity of 99 % RH, the capacitance of the sensor increased by 2.61 times, with respect to 30 % RH condition. The proposed sensor exhibits significantly improved sensitivity 560 fF/ % RH at 100 Hz, which is nearly 7.5 times as high as that of pristine TMBHPET-based humidity sensor. Further, the capacitive sensor exhibits improved dynamic range (30-99 % RH), small hysteresis ( 2.3 %), and relatively quicker response and recovery times ( 12 s, 14 s, respectively). It is assumed that the humidity response of the sensor is associated with the diffusion kinetics of water vapors and doping of the semiconductor nanocomposite by water molecules.

  10. Residual stress stability in fiber textured stoichiometric AlN film grown using rf magnetron sputtering

    SciTech Connect

    Sah, R. E.; Kirste, L.; Baeumler, M.; Hiesinger, P.; Cimalla, V.; Lebedev, V.; Baumann, H.; Zschau, H.-E.

    2010-05-15

    The authors report on the stability of mechanical stress with aging and thermal cycling for columnar structured stoichiometric and homogeneous aluminum nitride thin films grown using radio frequency magnetron sputtering technique. The set of deposition parameters were optimized for the best possible orientation of crystallites in the c axis of compositionally stoichiometric films. The as-grown stress in the slightly nitrogen-rich film does not change when exposed to the atmosphere following deposition, while that in the nitrogen-deficient film, it changes due to oxidation. Additionally, the magnitude of as-grown stress has been found to depend on the substrate material in addition to the deposition parameters. The stress in the film grown on a Si(001) substrate was more tensile than in the film grown on a semi-insulating (si) GaAs(001) substrate for a given set of deposition parameters. Furthermore, the stress in the film grown on Si decreased with temperature, while that on si GaAs increased, indicating the thermally induced stress component to be the major component in the residual stress. Upon subsequent cooling the stress changes in both substrates followed the same path as of heating, thus exhibiting no hysteresis with thermal cycles between room temperature and 400 deg. C.

  11. Nanocrystalline-CdS thin films grown on flexible PET-substrates by chemical bath deposition

    NASA Astrophysics Data System (ADS)

    Rodríguez-Rosales, K.; Quiñones-Galván, J. G.; Guillén-Cervantes, A.; Campos-González, E.; Santos-Cruz, J.; Mayén-Hernández, S. A.; Arias-Cerón, J. S.; Olvera, M. de la L.; Zelaya-Angel, O.; Hernández-Hernández, L. A.; Contreras-Puente, G.; de Moure-Flores, F.

    2017-07-01

    CdS thin films were grown on flexible PET and PET/ITO substrates by chemical bath deposition varying the deposition time. The structural analysis indicates that CdS films are composed of nano-crystalline and amorphous material. CdS films grown on PET substrates have hexagonal phase, while those grown on PET/ITO substrates have a cubic phase. The bandgap values of CdS films grown on PET substrates are in the range 2.31-2.45 eV, and the E g of CdS films grown on PET/ITO substrates are 2.18-2.42 eV. A strong green photoluminescence emission was observed in all the samples, which is associated to near band edge transitions. CdS films grown on PET/ITO substrates have an additional emission at 2.80 eV, which can be attributed to the presence of nano-crystals, in agreement with TEM analyses.

  12. Y1Ba2Cu3O7-δ thin films grown by magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Takano, Satoshi; Hayashi, Noriki; Okuda, Shigeru; Hitosuyanagi, Hajime

    1989-12-01

    Y1Ba2Cu3O7-δ thin films were grown on (100)MgO and polycrystalline YSZ substrates by RF magnetron sputtering. We measured the magnetic field dependence of Jc of these films. The films grown on MgO with Jc of 4.0x106, 2.9 x106 and 1.5x104 A/cm2 at OT showed 7.1x105 A/cm2 at 8T, 1x104 A/cm2 at 20T and 1.1x103 A/cm2 at 5 T, respectively . We could attain a c-axis oriented film with a Jc of 1.2x104 A/cm2 on YSZ polycrystalline substrate, however, it showed greater degradation than the films grown on MgO in Jc with magnetic field.

  13. Y 1Ba 2Cu 3O 7-δ thin films grown by magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Takano, Satoshi; Hayashi, Noriki; Okuda, Shigeru; Hitosuyanagi, Hajime

    1989-12-01

    Y 1Ba 2Cu 3O 7-δ thin films were grown on (100)MgO and polycrystalline YSZ substrates by RF magnetron sputtering. We measured the magnetic field dependence of Jc of these films. The films grown on MgO with Jc of 4.0x10 6, 2.9 x10 6 and 1.5x10 4 A/cm 2 at OT showed 7.1x10 5 A/cm 2 at 8T, 1x10 4 A/cm 2 at 20T and 1.1x10 3 A/cm 2 at 5 T, respectively . We could attain a c-axis oriented film with a Jc of 1.2x10 4 A/cm 2 on YSZ polycrystalline substrate, however, it showed greater degradation than the films grown on MgO in Jc with magnetic field.

  14. Enhanced performance of room-temperature-grown epitaxial thin films of vanadium dioxide

    SciTech Connect

    Nag, Joyeeta; Payzant, E Andrew; More, Karren Leslie; HaglundJr., Richard F

    2011-01-01

    Stoichiometric vanadium dioxide in bulk, thin film and nanostructured forms exhibits an insulator-to-metal transition (IMT) accompanied by a structural phase transformation, induced by temperature, light, electric fields, doping or strain. We have grown epitaxial films of vanadium dioxide on c-plane (0001) of sapphire using two different procedures involving (1) room temperature growth followed by annealing and (2) direct high temperature growth. Strain at the film-substrate interface due to growth at different temperatures leads to interesting differences in morphologies and phase transition characteristics. Comparison of the morphologies and switching characteristics of the two films shows that contrary to conventional wisdom, the room-temperature grown films have smoother, more continuous morphologies and better switching performance, consistent with the behavior of epitaxially grown semiconductors.

  15. Growth Mechanisms and Structural Properties of Lead Chalcogenide Films Grown by Pulsed Laser Deposition

    NASA Astrophysics Data System (ADS)

    Virt, I. S.; Rudyi, I. O.; Lopatynskyi, I. Ye.; Dubov, Yu.; Tur, Y.; Lusakowska, E.; Luka, G.

    2017-01-01

    Three lead chalcogenide films, PbTe, PbSe, and PbS, with a high structural quality were grown by pulsed lased deposition (PLD). The films were grown on single crystal substrates (Si, KCl, Al2O3) and on Si covered with a Si3N4 buffer layer. The Si3N4 layer latter facilitated the lead chalcogenide layer nucleation during the first growth stages and resulted in a more homogeneous surface morphology and a lower surface roughness. The surface geometry (roughness) of the films grown on Si3N4 was studied by means of the power spectral density analysis. Different growth modes, ranging from plasma plume condensation to bulk diffusion, resulting in observed film morphologies were identified. The investigations were complemented by electrical characterization of the chalcogenide films.

  16. Structural and magnetic properties of NiZn-ferrite thin films prepared by radio frequency magnetron sputtering

    SciTech Connect

    Liu Yingli; Li Yuanxun; Zhang Huaiwu; Chen Daming; Mu Chunhong

    2011-04-01

    Polycrystalline NiZn-ferrite thin films were deposited on Si(100) substrate by rf magnetron sputtering, using targets with a nominal composition of Ni{sub 0.5}Zn{sub 0.5}Fe{sub 2}O{sub 4}. The effects of substrate condition, sputtering pressure, and postannealing on the structure and magnetic properties of thin films have been investigated. Our results show that the preferred orientation of the NiZn spinel film changed from (311) to (400) with increasing the Ar pressure from 0.8 to 1.6 Pa, meanwhile, the grain size also increased. Atomic force microscopy analysis indicates that perfect surface morphology of the film can be obtained at a relatively lower sputtering pressure of 1.0 Pa. The relative percentage of residual oxygen increases significantly on a condition of lower sputtering pressure, and plays an important role in film structure due to the strong molecular adsorption tendency of oxygen on the film surface during the deposition process. A thin film with a typical thickness of 1 {mu}m, a saturation magnetization of 150 emu/cm{sup 3}, and a coercivity of 8.8 kA/m has been obtained after annealing at 800 deg. C, which has the potential application in magnetic integrated circuits.

  17. Oscillatory Nernst effect in Pt|ferrite|cuprate-superconductor trilayer films.

    PubMed

    Shiomi, Y; Lustikova, J; Saitoh, E

    2017-07-13

    Although magnetism and superconductivity hardly coexist in a single material, recent advances in nanotechnology and spintronics have brought to light their interplay in magnetotransport in thin-film heterostructures. Here, we found a periodic oscillation of Nernst voltage with respect to magnetic fields in Pt|LiFe5O8 (Pt|LFO) bilayers grown on a cuprate superconductor YBa2Cu3O7-x (YBCO). At high temperatures above the superconducting transition temperature (T C ) of YBCO, spin Seebeck voltages originating in Pt|LFO layers are observed. As temperature decreases well below T C , the spin Seebeck voltage is suppressed and unconventional periodic voltage oscillation as a function of magnetic fields appears; such an oscillation emerging along the Hall direction in the superconducting state has not been observed yet. Dynamics of superconducting vortices pinned by surface precipitates seems responsible for the oscillatory Nernst effect.

  18. Oxide Ceramic Films Grown on 60 Nitinol for NASA and Department of Defense Applications

    NASA Technical Reports Server (NTRS)

    Miyoshi, Kazuhisa; Street, Kenneth W.; Lukco, Dorothy; Cytron, Sheldon J.

    2005-01-01

    Both the NASA Glenn Research Center and the U.S. Army Research Laboratory, Development and Engineering Center (ARDEC) have worked to develop oxide ceramic films grown on 60 nitinol (60-wt% nickel and 40-wt% titanium) to decrease friction and increase wear resistance under unlubricated conditions. In general, oxide and nonoxide ceramic films have unique capabilities as mechanical-, chemical-, and thermal-barrier materials in diverse applications, including high-temperature bearings and gas bearings requiring low friction, wear resistance, and chemical stability. All oxide ceramic films grown on 60 nitinol were furnished by ARDEC, and materials and surface characterization and tribological experiments were conducted at Glenn.

  19. Pb"1"-"xFe"xS nanoparticle films grown from acidic chemical bath [rapid communication

    NASA Astrophysics Data System (ADS)

    Joshi, Rakesh K.; Subbaraju, G. V.; Sharma, Renu; Sehgal, H. K.

    2004-12-01

    Pb 1- xFe xS ( x=0.25, 0.50, 0.75) films were grown from an acidic chemical bath. Nanoparticle films were structurally characterized by XRD and TEM. Optical band gap of films is observed to vary from 1.65 to 1.42 eV with increase in their iron concentration from x=0.25 to 0.75 in the films. Increased optical band gap of the ternary films compared to the estimated bulk value is attributed to quantum confinement in the nanocrystals deposited on solid substrates.

  20. Characterization of hot wall grown silver phthalocyanine films

    NASA Astrophysics Data System (ADS)

    Gupta, Himani; Bedi, R. K.; Mahajan, Aman

    2007-10-01

    Silver phthalocyanine (AgPc) has attracted considerable interest because of its outstanding chemical stability, optical and electrical properties, and wide variety of potential applications in modern optical recording and optoelectronic devices. To improve the performance of devices based on AgPc, hot wall technique has been used to grow thin layers of AgPc onto the glass substrates kept at different temperatures in a vacuum of 10-5Torr. The films so obtained are annealed and studied for structural, electrical, and optical characterization. The x-ray diffraction and scanning electron microscopy pattern of these films show a crystalline behavior of films. The films deposited at higher substrate temperature suggest the formation of more ordered and crystalline films. An analysis of optical absorption measurements on the films indicates that the interband transition energies lie in the range 4.1-4.13eV.

  1. Characterization of Nanoporous WO3 Films Grown via Ballistic Deposition

    SciTech Connect

    Smid, Bretislav; Li, Zhenjun; Dohnalkova, Alice; Arey, Bruce W.; Smith, R. Scott; Matolin, Vladimir; Kay, Bruce D.; Dohnalek, Zdenek

    2012-05-17

    We report on the preparation and characterization of high surface area, supported nanoporous tungsten oxide films prepared under different conditions on polished polycrystalline Ta and Pt(111) substrates via direct sublimation of monodispersed gas phase of cyclic (WO3)3 clusters. Scanning Electron Microscopy and Transmission Electron Microscopy were used to investigate the film morphology on a nanometer scale. The films consist of arrays of separated filaments that are amorphous. The chemical composition and the thermal stability of the films were investigated by means of X-ray Photoelectron Spectroscopy. The surface area and the distribution of binding sites on the films are measured as functions of growth temperature, deposition angle, and annealing conditions using temperature programmed desorption of Kr. Films deposited at 20 K and at an incident angle of 65{sup o} from substrate normal display the greatest specific surface area of {approx}560 m2/g.

  2. Characterization of epitaxially grown films of vanadium oxides

    SciTech Connect

    Rogers, K.D.; Coath, J.A.; Lovell, M.C. , Shrivenham, Swindon, Wiltshire, SN6 8LA, England )

    1991-08-01

    The growth of VO{sub 2} and V{sub 2}O{sub 3} thin films by reactive sputtering has been investigated. Previously reported studies of such thin films have often presented ambiguous results concerning the precise nature of the layers produced. A thorough and comprehensive characterization program including x-ray diffraction, scanning electron microscopy, Rutherford-backscattering spectroscopy, and electrical conductivity measurements has been undertaken to ensure that the films produced were of a true epitaxial nature.

  3. Properties and orientation of antiferroelectric lead zirconate thin films grown by MOCVD.

    SciTech Connect

    Chen, N.

    1998-12-21

    Single-phase polycrystalline PbZrO{sub 3} (PZ) thin films, 3000-6000 {angstrom} thick, have been grown by metal-organic chemical vapor deposition (MOCVD) on (111)Pt/Ti/SiO{sub 2}/Si substrates at {approximately}525 C. X-ray diffraction analysis indicated that the PZ films grown on (111)Pt/Ti/SiO{sub 2}/Si (Pt/Ti/Si) showed preferred pseudocubic (110) orientation. In contrast, PZ films grown on 150 {angstrom} thick PbTiO{sub 3} (PT) template layers exhibited a pseudocubic (100) preferred orientation, and PZ films deposited on TiO{sub 2} template layers consisted of randomly oriented grains. The PZ films grown on Pt/Ti/Si with or without templates exhibited dielectric constants of 120-200 and loss tangents of 0.03-0.01. The PZ films with (110) orientation exhibited an electric-field-induced transformation from the antiferroelectric phase to the ferroelectric phase with a polarization of {approx}34 {micro}C/cm{sup 2}, and the energy that was stored during switching was 7.1 J/cm{sup 3}. The field needed to excite the ferroelectric state and that needed to revert to the antiferroelectric state were 350 and 250 kV/cm, respectively. Relationships between the MOCVD processing and the film microstructure and properties are discussed.

  4. Europium and samarium doped calcium sulfide thin films grown by PLD

    NASA Astrophysics Data System (ADS)

    Christoulakis, S.; Suchea, M.; Katsarakis, N.; Koudoumas, E.

    2007-07-01

    Europium and samarium doped calcium sulfide thin films (CaS:Eu,Sm) with different thickness were prepared by the pulsed laser deposition technique using sintered targets. A typical homemade deposition chamber and XeCl excimer laser (308 nm) were employed and the films were deposited in helium atmosphere onto silicon and corning glass substrates. Structural investigations carried out by X-ray diffraction and atomic force microscopy showed a strong influence of the deposition parameters on the film properties. The films grown had an amorphous or polycrystalline structure depending on growth temperature and the number of pulses used, the same parameters affecting the film roughness, the grain shape and dimensions, the film thickness and the optical transmittance. This work indicates that pulsed laser deposition can be a suitable technique for the preparation of CaS:Eu,Sm thin films, the film characteristics being controlled by the growth conditions.

  5. Photoresponse in thin films of WO{sub 3} grown by pulsed laser deposition

    SciTech Connect

    Roy Moulik, Samik; Samanta, Sudeshna; Ghosh, Barnali

    2014-06-09

    We report, the photoresponse behaviour of Tungsten trioxide (WO{sub 3}) films of different surface morphology, grown by using pulsed laser deposition (PLD). The Growth parameters for PLD were changed for two substrates SiO{sub 2}/Si (SO) and SrTiO{sub 3} (STO), such a way which, result nanocrystalline film on SO and needle like structured film on STO. The photoresponse is greatly modified in these two films because of two different surface morphologies. The nanocrystalline film (film on SO) shows distinct photocurrent (PC) ON/OFF states when light was turned on/off, the enhancement of PC is ∼27%. Whereas, the film with needle like structure (film on STO) exhibits significantly enhanced persistent photocurrent even in light off condition, in this case, the enhancement of PC ∼ 50% at room temperature at lowest wavelength (λ = 360 nm) at a nominal bias voltage of 0.1 V.

  6. Thickness-dependent optical properties in compressively strained BiFeO{sub 3}/LaAlO{sub 3} films grown by pulsed laser deposition

    SciTech Connect

    Duan, Zhihua; Jiang, Kai; Wu, Jiada; Sun, Jian; Hu, Zhigao; Chu, Junhao

    2014-03-01

    Graphical abstract: - Highlights: • BFO with various thicknesses was grown on LAO substrates by pulsed laser deposition. • The structure and compressive strains were clarified via Raman scattering. • The charge transfer excitation was blue shifted with increasing compressive strain. • The compressive strain affects the distortion of Fe{sup 3+} local environment and O 2p states. - Abstract: Bismuth ferrite (BiFeO{sub 3}) films with various thicknesses were epitaxially grown on LaAlO{sub 3} substrates by pulsed laser deposition. The X-ray diffraction and Raman scattering spectra reveal that the films were highly (11{sup ¯}1) oriented with the single phase. With increasing the thickness, the compressive strain decreases and the strain ratios between the film and bulk crystal are evaluated to be 1.75, 1.57, and 1. Moreover, the compressive strain induces band gap shrinkage from 2.7 to 2.65 eV, while the charge transfer transition energy increases from 3.5 to 4.1 eV. It could be due to the shift of O 2p states and the variation of local Fe{sup 3+} crystal field.

  7. A Comparison between AlN Films Grown by MOCVD Using Dimethylethylamine Alane and Trimethylaluminium as the Aluminium Precursors

    NASA Astrophysics Data System (ADS)

    Hu, Wei-Guo; Liu, Xiang-Lin; Zhang, Pan-Feng; Zhao, Feng-Ai; Jiao, Chun-Mei; Wei, Hong-Yuan; Zhang, Ri-Qing; Wu, Jie-Jun; Cong, Guang-Wei; Pan, Yi

    2007-02-01

    Aluminium nitride (AlN) films grown with dimethylethylamine alane (DMEAA) are compared with the ones grown with trimethylaluminium (TMA). In the high-resolution x-ray diffraction Ω scans, the full width at half maximum (FWHM) of (0002) AlN films grown with DMEAA is about 0.70 deg, while the FWHM of (0002) AlN films grown with TMA is only 0.11 deg. The surface morphologies of the films are different, and the rms roughnesses of the surface are approximately identical. The rms roughness of AlN films grown with DMEAA is 47.4 nm, and grown with TMA is 69.4 nm. Although using DMEAA as the aluminium precursor cannot improve the AlN crystal quality, AlN growth can be reached at low temperature of 673 K. Thus, DMEAA is an alternative aluminium precursor to deposit AlN film at low growth temperatures.

  8. Cu(In, Ga)Se2 thin film solar cells grown at low temperatures

    NASA Astrophysics Data System (ADS)

    Zhang, W.; Zhu, H.; Zhang, L.; Guo, Y.; Niu, X.; Li, Z.; Chen, J.; Liu, Q.; Mai, Y.

    2017-06-01

    Cu(In, Ga)Se2 (CIGS) thin film solar cells were grown on polyimide (PI) and soda lime glass (SLG) substrates at low substrate temperatures between 400 °C and 500 °C. Different material properties of the CIGS thin films and photovoltaic performances of the solar cells were systematically investigated. It is found that the (112), (220)/(204) and (116)/(312) peaks from X-ray diffraction (XRD) patterns show double-peak patterns as the substrate temperature decreases. The CIGS thin films grown on both PI and SLG substrates shows layered structures. The bottom and surficial layers of CIGS thin films display small size polycrystalline grains while the middle layers show large size polycrystalline grains. Both types of CIGS thin film solar cells exhibit similar efficiencies while CIGS thin film solar cells grown on PI substrates show lower open circuit voltage and fill factor but higher short circuit current density, as compared to those of CIGS thin film solar cells on SLG substrates. The highest efficiency of 6.14% has been achieved for the CIGS thin film solar cells on PI with the structure of PI/Mo/CIGS/CdS/i-ZnO/ZnO:Al/Al grid here.

  9. Micromagnetics and microstructure of epitaxially grown Co and Co-Cr films for perpendicular magnetic recording

    NASA Astrophysics Data System (ADS)

    Krishnan, K. M.; Takeuchi, T.; Hirayama, Y.; Donnet, D. M.; Honda, Y.; Futamoto, M.

    1994-07-01

    Highly c-axis oriented, single crystal films of Co(1-x)Cr(x) (0 less than or equal to x less than 0.3) have been grown epitaxially on mica substrates by e-beam evaporation. Films grown on Ru underlayers have an average grain size of 50-80 nm, negligibe fcc content, and very narrow c-axis dispersions. For Co films (x = 0), the as-grown magnetization structure are mainly 180 degree domain walls with a uniform distribution of cross-ties for thinner samples (less than or equal to 300 Angstrom), while thicker (greater than 400 Angstrom) ones show stripe domains. These images were analyzed in detail to measure the wall widths and associated energy densities for as-grown, remanent, and ac-magnetized samples. As expected, the magnetic properties of these films are composition dependent. However, for any Cr concentration, these films exhibit the largest saturation magnetization when compared with either sputtered or evaporated samples. This enhancement can be attributed to a nanometer-scale segregation of Cr, which in these samples could be particularly aided by the diffusion on the close-packed planes of the films with very narrow c-axis dispersions. Preliminary x-ray microanalysis and NMR data support this interpretation.

  10. Controlling the grain size of polycrystalline TiO2 films grown by atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Kavre Piltaver, Ivna; Peter, Robert; Šarić, Iva; Salamon, Krešimir; Jelovica Badovinac, Ivana; Koshmak, Konstantin; Nannarone, Stefano; Delač Marion, Ida; Petravić, Mladen

    2017-10-01

    The crystal structure and the grain size of thin TiO2 films grown by atomic layer deposition (ALD) were characterized by scanning electron microscopy, grazing incidence X-ray diffraction, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, atomic force microscopy, and near-edge X-ray absorption fine structure spectroscopy. The films of different thicknesses between 50 and 150 nm were grown at temperatures between 200 and 250 °C with a TiCl4-H2O ALD process on two different substrates, Si and NiTi. The grain size of the anatase TiO2 was dramatically increased if a thin buffer layer of Al2O3 was deposited on substrates in the same ALD sequence prior to the TiO2 deposition. The largest TiO2 plate-like grains of more than one micrometer in diameter were observed on 150 nm thick films grown at 250 °C. The present work demonstrates that the grain size of an anatase TiO2 film can be tailored and controlled on different substrates not only by the processing temperature and film thickness, but, more dramatically, by the nanometric intermediate Al2O3 layers deposited on substrates in the same ALD sequences. The large lateral grain size is explained in terms of low density of the initial nucleation grains created in TiO2 films grown on Al2O3 layers.

  11. Electrochromic behavior in CVD grown tungsten oxide films

    NASA Astrophysics Data System (ADS)

    Gogova, D.; Iossifova, A.; Ivanova, T.; Dimitrova, Zl; Gesheva, K.

    1999-03-01

    Solid state electrochemical devices (ECDs) for smart windows, large area displays and automobile rearview mirrors are of considerable technological and commercial interest. In this paper, we studied the electrochromic properties of amorphous and polycrystalline CVD carbonyl tungsten oxide films and the possibility for sol-gel thin TiO 2 film to play the role of passive electrode in an electrochromic window with solid polymer electrolyte.

  12. Effect of Heat Treatments on the Structural and Magnetic Properties of La-Co Substituted Strontium Ferrite Films

    NASA Astrophysics Data System (ADS)

    Hui, Yajuan; Cheng, Weiming; Lin, Gengqi; Miao, Xiangshui

    2014-09-01

    A sputter-deposited strontium ferrite film with perpendicular anisotropy has been developed. The film, composed of La0.33Sr0.67Co0.25Fe11.75O19, has been fabricated directly on quartz glass substrates by radio frequency magnetron sputtering with various heat treatments. The structural and magnetic property dependence of those films on heat treatments has also been studied. The optimized condition is the heat treatment of in situ heating at 400°C and post-annealing at 850°C-900°C. When post-annealing temperature exceeds 900°C, parasitic phases of γ-Fe2O3 and LaFeO3 appear and gradually increase; meanwhile, the magneto plumbite phase gradually decreases. High c-axis perpendicularly oriented films with the coercivity (4148 Oe), remanence squareness ratio (0.89) and perpendicular magnetic anisotropy energy density (1.65 × 106 erg/cm3) are achieved, which is attributed to the single magneto plumbite phase with compact platelet grains and almost complete (0 0 l) texture of the c-axis normal to the film plane.

  13. Optical and mechanical properties of nanocrystalline ZrC thin films grown by pulsed laser deposition.

    DOE PAGES

    Craciun, D.; Socol, G.; Lambers, E.; ...

    2015-01-17

    Thin ZrC films (<500 nm) were grown on (100) Si substrates at a substrate temperature of 500 °C by the pulsed laser deposition (PLD) technique using a KrF excimer laser under different CH4 pressures. Glancing incidence X-ray diffraction showed that films were nanocrystalline, while X-ray reflectivity studies found out films were very dense and exhibited a smooth surface morphology. Optical spectroscopy data shows that the films have high reflectivity (>90%) in the infrared region, characteristic of metallic behavior. Nanoindentation results indicated that films deposited under lower CH4 pressures exhibited slightly higher nanohardness and Young modulus values than films deposited undermore » higher pressures. As a result, tribological characterization revealed that these films exhibited relatively high wear resistance and steady-state friction coefficients on the order of μ = 0.4.« less

  14. Microhardness studies on thin carbon films grown on P-type, (100) silicon

    NASA Technical Reports Server (NTRS)

    Kolecki, J. C.

    1982-01-01

    A program to grow thin carbon films and investigate their physical and electrical properties is described. Characteristics of films grown by rf sputtering and vacuum arc deposition on p type, (100) silicon wafers are presented. Microhardness data were obtained from both the films and the silicon via the Vickers diamond indentation technique. These data show that the films are always harder than the silicon, even when the films are thin (of the order of 1000 A). Vacuum arc films were found to contain black carbon inclusions of the order of a few microns in size, and clusters of inclusions of the order of tens of microns. Transmission electron diffraction showed that the films being studied were amorphous in structure.

  15. Optical and mechanical properties of nanocrystalline ZrC thin films grown by pulsed laser deposition.

    SciTech Connect

    Craciun, D.; Socol, G.; Lambers, E.; McCumiskey, E. J.; Taylor, C. R.; Martin, C.; Argibay, Nicolas; Craciun, V.; Tanner, D. B.

    2015-01-17

    Thin ZrC films (<500 nm) were grown on (100) Si substrates at a substrate temperature of 500 °C by the pulsed laser deposition (PLD) technique using a KrF excimer laser under different CH4 pressures. Glancing incidence X-ray diffraction showed that films were nanocrystalline, while X-ray reflectivity studies found out films were very dense and exhibited a smooth surface morphology. Optical spectroscopy data shows that the films have high reflectivity (>90%) in the infrared region, characteristic of metallic behavior. Nanoindentation results indicated that films deposited under lower CH4 pressures exhibited slightly higher nanohardness and Young modulus values than films deposited under higher pressures. As a result, tribological characterization revealed that these films exhibited relatively high wear resistance and steady-state friction coefficients on the order of μ = 0.4.

  16. Tungsten nitride films grown via pulsed laser deposition studied in situ by electron spectroscopies

    NASA Astrophysics Data System (ADS)

    Soto, G.; de la Cruz, W.; Castillón, F. F.; Díaz, J. A.; Machorro, R.; Farías, M. H.

    2003-05-01

    Tungsten nitride (WN x) films were grown on silicon and glass slide substrates by laser ablating a tungsten target in molecular nitrogen ambient. By in situ Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS) and electron energy loss spectroscopy (EELS), the films density, elemental composition and chemical state were determined. Ex situ, the films were characterized by scanning electron microscopy (SEM) and X-ray diffraction (XRD). Also, the transmittance and resistivity of the film on glass substrates were determined. The results show that the reaction of tungsten and nitrogen is effective; the nitrogen is integrated in the tungsten matrix changing gradually the electronic configuration, chemical states and film properties. Since with this preparation method the obtained films are of high quality, low resistivity and dense, this makes attractive to growth tungsten nitride films for technological applications.

  17. Mechanism of Charge Transport in Cobalt and Iron Phthalocyanine Thin Films Grown by Molecular Beam Epitaxy

    SciTech Connect

    Kumar, Arvind; Samanta, Soumen; Singh, Ajay; Debnath, A. K.; Aswal, D. K.; Gupta, S. K.

    2011-12-12

    Cobalt phthalocyanine (CoPc), iron phthalocyanine (FePc) and their composite (CoPc-FePc) films have been grown by molecular beam epitaxy (MBE). Grazing incidence X-ray diffraction (GIXRD) and scanning electron microscope (SEM) studies showed that composite films has better structural ordering compared to individual CoPc and FePc films. The temperature dependence of resistivity (in the temperature range 25 K- 100 K) showed that composite films are metallic, while individual CoPc and FePc films are in the critical regime of metal-to-insulator (M-I) transition The composite films show very high mobility of 110 cm{sup 2} V{sup -1} s{sup -1} at room temperature i.e. nearly two order of magnitude higher compared to pure CoPc and FePc films.

  18. PbTe thin films grown by femtosecond pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Rodriguez, E.; Silva, D.; Moya, L.; Cesar, C. L.; Barbosa, L. C.; Schrank, A.; Souza Filho, C. R.; de Oliveira, E. P.

    2007-09-01

    PbTe thin films were grown on BK7 glass and Si(100) substrates using femtosecond pulsed laser deposition at room temperature. The influence of the background pressure and the laser fluence on the structural and optical characteristics of the PbTe films was studied. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) were used to characterize the surface and structural properties of the deposited PbTe thin films, respectively. Transmission spectroscopy measurements in the visible and infrared region (VIS-IR) were used to investigate the optical properties of the PbTe thin films.

  19. Growth and atomic structure of tellurium thin films grown on Bi2Te3

    NASA Astrophysics Data System (ADS)

    Okuyama, Yuma; Sugiyama, Yuya; Ideta, Shin-ichiro; Tanaka, Kiyohisa; Hirahara, Toru

    2017-03-01

    We have grown tellurium (Te) thin films on Bi2Te3 and investigated the atomic structure. From low-energy electron diffraction (LEED) measurements, we found that the Te films are [10 1 bar0]-oriented with six domains. A detailed analysis of the reflection high-energy electron diffraction (RHEED) pattern revealed that the films are strained with the in-plane lattice constant compressed by ∼1.5% compared to the bulk value due to the epitaxy between Te and Bi2Te3. These films will be interesting systems to investigate the predicted topological phases that occur in strained Te.

  20. Some studies on successive ionic layer adsorption and reaction (SILAR) grown indium sulphide thin films

    SciTech Connect

    Pathan, H.M.; Lokhande, C.D. . E-mail: l_chandrakant@yahoo.com; Kulkarni, S.S.; Amalnerkar, D.P.; Seth, T.; Han, Sung-Hwan . E-mail: shhan@hanyang.ac.kr

    2005-06-15

    Indium sulphide (In{sub 2}S{sub 3}) thin films were grown on amorphous glass substrate by the successive ionic layer adsorption and reaction (SILAR) method. X-ray diffraction, optical absorption, scanning electron microscopy (SEM) and Rutherford back scattering (RBS) were applied to study the structural, optical, surface morphological and compositional properties of the indium sulphide thin films. Utilization of triethanolamine and hydrazine hydrate complexed indium sulphate and sodium sulphide as precursors resulted in nanocrystalline In{sub 2}S{sub 3} thin film. The optical band gap was found to be 2.7 eV. The film appeared to be smooth and homogeneous from SEM study.

  1. The influence of Cd doping on the microstructure and optical properties of nanocrystalline copper ferrite thin films

    SciTech Connect

    El-Hagary, M.; Matar, A.; Shaaban, E.R.; Emam-Ismail, M.

    2013-06-01

    Highlights: ► The structural and optical properties of Cu{sub 1−x}Cd{sub x}Fe{sub 2}O{sub 4} thin films were studied. ► The micro structural parameters of the films have been determined. ► The room temperature reflectance and transmittance data are analyzed. ► The refractive index and energy gap are determined. ► The single oscillator parameters were calculated. - Abstract: Nanocrystalline thin films of mixed Cu–Cd ferrites, Cu{sub 1−x}Cd{sub x}Fe{sub 2}O{sub 4} (x = 0, 0.2, 0.3, 0.5, 0.7, 0.8, 0.9 and 1), were deposited by electron beam evaporation technique. The films were annealed at 450 °C for 1 h. The effect of Cd doping on the structural and optical properties of the deposited films has been investigated by using X-ray diffraction (XRD) and optical spectrophotometry. XRD patterns of the annealed films show spinal cubic structure. The lattice parameter was found to increase with the increase of cadmium concentration. The crystallite size of the films was found to vary from 8 nm to 30 nm. The optical transition was found to be direct and indirect transitions with energy gaps decrease from 2.466 (x = 0) to 2.00 (x = 1) eV and from 2.148 (x = 0) to 1.824 (x = 1) eV, respectively. The refractive index dispersion of the films was found to increase with Cd content and discussed in terms of the Wemple–DiDomenico single oscillator model.

  2. Magnetic properties of hexagonal barium ferrite films on Pt/MgO(111) substrates annealed at different temperatures

    NASA Astrophysics Data System (ADS)

    Zheng, Hui; Han, Mangui; Zheng, Liang; Deng, Jiangxia; Zheng, Peng; Wu, Qiong; Deng, Longjiang; Qin, Huibin

    2016-09-01

    In this work, hexagonal barium ferrite thin films have been deposited on Pt/MgO(111) substrates by pulsed laser deposition. The anneal temperature dependence of crystal structures, extents of diffusion and magnetic properties have been studied. X-ray diffraction patterns reveal that the crystal structure changes from the hexagonal to the spinel when the anneal temperature increases. The texture with c-axis perpendicular to the film plane and the small c-axis dispersion angles (△ɵc) have been obtained in the film annealed at 950 °C for 10 h. Both the X-ray photoelectron spectroscopy profiles and energy dispersive spectrometer show that the diffusions of Mg2+and Fe3+cations are more obvious when the annealing temperature is higher than 950 °C. The film annealed at 950 °C show anisotropic and hard magnetic properties. The magnetic properties of film annealed at 1050 °C are soft. In order to study the cation diffusions between thin film and substrate, the concentration profiles of cations (Ba2+, Fe3+, Mg2+) have been measured by XPS for a thin film with a thickness of 130 nm annealed at 950°C and 1050°C, as shown in Fig. 3. When Ta is 950°C, as shown in Fig. 3(a), diffusions between the film and the substrate are scarcely detected. However, obvious inter-diffusions have been found for Mg2+ cation and Fe3+ cation when it is annealed at 1050°C. An obvious diffusion has not been found for Ba2+ cation at both annealing temperatures.

  3. Atomic and electronic structure of Fe films grown on Pd l brace 001 r brace

    SciTech Connect

    Quinn, J.; Li, Y.S.; Li, H.; Tian, D.; Jona, F. ); Marcus, P.M. )

    1991-02-15

    The atomic and electronic structure of Fe films grown on Pd{l brace}001{r brace} is investigated by means of low-energy electron diffraction and angle-resolved photoemission spectroscopy (ARPES). The films grow pseudomorphically, probably by way of nucleation and growth of flat islands, which ultimately coalesce to form continuous Fe{l brace}001{r brace} films. The structure of these continuous films, if grown at slow rates (of the order of 0.1 A/min), is body-centered tetragonal and is shown to be a distortion from the stable bcc structure of Fe: the in-plane lattice constant is 2.75 A, as dictated by the Pd{l brace}001{r brace} substrate, and the bulk interlayer spacing is 1.50--1.53 A. In 10--12-layer films the first interlayer spacing is expanded by 3.6% above bulk, but with increasing thickness that spacing contracts progressively to about 6.3% below the bulk value in 40--50-layer films. Films as thick as 60--70 layers can be grown pseudomorphically at slow rates despite the large misfit (4.2%) between bcc Fe{l brace}001{r brace} and fcc Pd{l brace}001{r brace}. ARPES data indicate that these films are electronically indistinguishable from bulk bcc Fe. Thick (about 200-layer) films grown at fast rates are essentially bcc, with in-plane lattice constants of 2.87 A, but with slightly expanded (3%) interlayer spacing, attributed to the presence of carbon impurities.

  4. Thin YBCO films on ? (001) substrates grown by injection MOCVD

    NASA Astrophysics Data System (ADS)

    Abrutis, A.; Sénateur, J. P.; Weiss, F.; Kubilius, V.; Bigelyte, V.; Saltyte, Z.; Vengalis, B.; Jukna, A.

    1997-12-01

    YBCO thin (about 0953-2048/10/12/021/img10) films were deposited at 0953-2048/10/12/021/img11 on 0953-2048/10/12/021/img12 (001) by single-source injection CVD. Precisely controlled microamounts of organometallic 0953-2048/10/12/021/img13-diketonates dissolved in an organic solvent were injected sequentially into the evaporator by means of a computer-driven injector and the resultant vapour was transported into the deposition zone. The influence of the vapour phase composition on films' properties was investigated. A mixture of 0953-2048/10/12/021/img14 and 0953-2048/10/12/021/img15-oriented YBCO crystallites exists in all deposited films and its ratio depends on the vapour phase composition. For both a and c perpendicular crystallites only 0953-2048/10/12/021/img16 in-plane orientation with respect to substrate axes was found. Bidirectional twinning was established in the crystallites of both types. 0953-2048/10/12/021/img17 of the films (about 90 K) was almost independent of the vapour phase composition in the studied range. However, the critical current density 0953-2048/10/12/021/img18 depended clearly on the vapour phase composition in relation to the 0953-2048/10/12/021/img19 ratio variation. 0953-2048/10/12/021/img18 of the films varied in the range 0953-2048/10/12/021/img21.

  5. Friction and wear performance of diamondlike carbon films grown in various source gas plasmas

    SciTech Connect

    Erdemir, A.; Nilufer, I. B.; Eryilmaz, O. L.; Beschliesser, M.; Fenske, G. R.

    2000-01-18

    In this study, the authors investigated the effects of various source gases (methane, ethane, ethylene, and acetylene) on the friction and wear performance of diamondlike carbon (DLC) films prepared in a plasma enhanced chemical vapor deposition (PECVD) system. Films were deposited on AISI H13 steel substrates and tested in a pin-on-disk machine against DLC-coated M50 balls in dry nitrogen. They found a close correlation between friction coefficient and source gas composition. Specifically, films grown in source gases with higher hydrogen-to-carbon ratios exhibited lower friction coefficients and higher wear resistance than films grown in source gases with lower hydrogen-to-carbon (H/C) ratios. The lowest friction coefficient (0.014) was achieved with a film derived from methane with an WC ratio of 4, whereas the coefficient of films derived from acetylene (H/C = 1) was of 0.15. Similar correlations were observed for wear rates. Specifically, films derived from gases with lower H/C values were worn out and the substrate material was exposed, whereas films from methane and ethane remained intact and wore at rates that were nearly two orders of magnitude lower than films obtained from acetylene.

  6. Mott-barrier diodes based on epitaxially grown n-GaAs films

    NASA Astrophysics Data System (ADS)

    Averin, S. V.; Azakian, E. A.; Guliaev, Iu. V.; Dmitriev, M. D.; Liubchenko, V. E.; Petrenko, I. V.; Sveshnikov, Iu. N.

    The fabrication and properties of epitaxially grown n-GaAs film Mott-barrier diodes are examined. The doping profile of a film grown via gas-phase epitaxy is presented, and the volt-farad characteristics of Schottky and Mott diodes are compared. An investigation of frequency conversion shows that the optimal heterodyne power for the Mott diode is significantly lower than that for the Schottky diode, which makes it possible to reduce the mixer noise temperature. It is noted that Mott-barrier diodes are particularly suitable for the submillimeter range.

  7. Polymer thin films embedded with in situ grown metal nanoparticles.

    PubMed

    Ramesh, G V; Porel, S; Radhakrishnan, T P

    2009-09-01

    Metal nanoparticle-polymer composites are versatile materials which not only combine the unique characteristics of the components, but also manifest mutualistic effects between the two. Embedding inside polymer thin films facilitates immobilization and organization of the metal nanoparticles and tuning of their electronic and optical responses by the dielectric environment. The embedded metal nanoparticles in turn can impact upon the various material attributes of the polymer matrix. Some of the most convenient and attractive routes to the fabrication of metal nanoparticle-embedded polymer thin films involve in situ generation of the nanoparticles through reduction or decomposition of appropriate precursors inside the solid film. In this tutorial review we present an overview of the different methodologies developed using this general concept and describe the environment-friendly protocol we have optimized for the fabrication of noble metal nanostructures inside polymer thin films, using aqueous media for the synthesis and deploying the polymer itself as the reducing as well as stabilizing agent. A variety of techniques that have been exploited to characterize the precursor to product transformation inside the polymer film are discussed. The unique control provided by the in situ fabrication route on the size, shape and distribution of the nanostructures, and application of the polymer thin films with the in situ generated metal nanoparticles in areas such as nonlinear optics, surface enhanced Raman scattering, e-beam lithography, microwave absorption, non-volatile memory devices and random lasers, illustrate the versatility of these materials. A brief appraisal of the avenues for future developments in this area is presented.

  8. Lightweight sodium alanate thin films grown by reactive sputtering

    SciTech Connect

    Filippi, M.; Rector, J. H.; Gremaud, R.; Setten, M. J. van; Dam, B.

    2009-09-21

    We report the preparation of sodium alanate, a promising hydrogen storage material, in a thin film form using cosputtering in a reactive atmosphere of atomic hydrogen. We study the phase formation and distribution, and the hydrogen desorption, with a combination of optical and infrared transmission spectroscopy. We show that the hydrogen desorption, the phase segregation, and the role of the dopants in these complex metal hydrides can be monitored with optical measurements. This result shows that a thin film approach can be used for a model study of technologically relevant lightweight metal hydrides.

  9. Spin Seebeck effect in Y-type hexagonal ferrite thin films

    NASA Astrophysics Data System (ADS)

    Hirschner, J.; Maryško, M.; Hejtmánek, J.; Uhrecký, R.; Soroka, M.; Buršík, J.; Anadón, A.; Aguirre, M. H.; Knížek, K.

    2017-08-01

    The longitudinal spin Seebeck effect (SSE) has been investigated using Pt/ferrite bilayers employing two Y-hexagonal ferrites Ba2Zn2Fe12O22 (Zn2Y) and Ba2Co2Fe12O22 (Co2Y) deposited by a spin-coating method on SrTiO3(111 ) substrates. The prepared hexagonal ferrites are highly oriented with c axes perpendicular to the substrate plane. The room-temperature magnetic moments of both ferrimagnetic ferrites amount to similar values and, most importantly, both have easy magnetization normal to the c axis. Despite their similar magnetic response the notable SSE signal is only observed for Zn2Y whereas the SSE signal of Co2Y is below the experimental noise level. A plausible explanation for this surprising discrepancy is magnetic disorder induced by cobalt cations, the random distribution of which in the Co2Y ferrite structure might critically limit the spin-wave propagation. This results in suppression of the SSE signal in Co2Y, while the Zn2Y with nonmagnetic substituent exhibits significant SSE signal. The temperature dependence of SSE for Zn2Y was measured over the 30 -300 -K range and quantitatively analyzed considering the heat flow through the Pt/Zn2Y bilayer and thermal gradient across the Zn2Y thin layer as the most relevant parameters. Using this approach the normalized SSE smoothly increases with lowering temperature, which correlates to increasing magnon propagation length and magnetization with decreasing temperature.

  10. Electron field emission from phase pure nanotube films grown in a methane/hydrogen plasma

    NASA Astrophysics Data System (ADS)

    Küttel, Olivier M.; Groening, Oliver; Emmenegger, Christoph; Schlapbach, Louis

    1998-10-01

    Phase pure nanotube films were grown on silicon substrates by a microwave plasma under conditions which normally are used for the growth of chemical vapor deposited diamond films. However, instead of using any pretreatment leading to diamond nucleation we deposited metal clusters on the silicon substrate. The resulting films contain only nanotubes and also onion-like structures. However, no other carbon allotropes like graphite or amorphous clustered material could be found. The nanotubes adhere very well to the substrates and do not need any further purification step. Electron field emission was observed at fields above 1.5 V/μm and we observed an emission site density up to 104/cm2 at 3 V/μm. Alternatively, we have grown nanotube films by the hot filament technique, which allows to uniformly cover a two inch wafer.

  11. Epitaxial growth of highly-crystalline spinel ferrite thin films on perovskite substrates for all-oxide devices

    PubMed Central

    Moyer, Jarrett A.; Gao, Ran; Schiffer, Peter; Martin, Lane W.

    2015-01-01

    The potential growth modes for epitaxial growth of Fe3O4 on SrTiO3 (001) are investigated through control of the energetics of the pulsed-laser deposition growth process (via substrate temperature and laser fluence). We find that Fe3O4 grows epitaxially in three distinct growth modes: 2D-like, island, and 3D-to-2D, the last of which is characterized by films that begin growth in an island growth mode before progressing to a 2D growth mode. Films grown in the 2D-like and 3D-to-2D growth modes are atomically flat and partially strained, while films grown in the island growth mode are terminated in islands and fully relaxed. We find that the optimal structural, transport, and magnetic properties are obtained for films grown on the 2D-like/3D-to-2D growth regime boundary. The viability for including such thin films in perovskite-based all-oxide devices is demonstrated by growing a Fe3O4/La0.7Sr0.3MnO3 spin valve epitaxially on SrTiO3. PMID:26030835

  12. Pure electron-electron dephasing in percolative aluminum ultrathin film grown by molecular beam epitaxy.

    PubMed

    Lin, Shih-Wei; Wu, Yue-Han; Chang, Li; Liang, Chi-Te; Lin, Sheng-Di

    2015-01-01

    We have successfully grown ultrathin continuous aluminum film by molecular beam epitaxy. This percolative aluminum film is single crystalline and strain free as characterized by transmission electron microscopy and atomic force microscopy. The weak anti-localization effect is observed in the temperature range of 1.4 to 10 K with this sample, and it reveals that, for the first time, the dephasing is purely caused by electron-electron inelastic scattering in aluminum.

  13. Enhanced magneto-optical Kerr effect in rare earth substituted nanostructured cobalt ferrite thin film prepared by sol-gel method

    NASA Astrophysics Data System (ADS)

    Avazpour, L.; Toroghinejad, M. R.; Shokrollahi, H.

    2016-11-01

    A series of rare-earth (RE)-doped nanocrystalline Cox RE(1-x) Fe2O4 (x = 0, 0.1, 0.2 and RE: Nd, Eu) thin films were prepared on silicon substrates by a sol-gel process, and the influences of different RE3+ ions on the microstructure, magnetism and polar magneto-optical Kerr effect of the deposited films were investigated. Also this research presents the optimization process of cobalt ferrite thin films deposited via spin coating, by studying their structural and morphological properties at different thicknesses (200, 350 nm) and various heat treatment temperatures 300-850 °C. Nanoparticulate polycrystalline thin film were formed with heat treatment above 400 °C but proper magnetic properties due to well crystallization of the film were achieved at about 650 °C. AFM results indicated that the deposited thin films were crack-free exhibiting a dense nanogranular structure. The root-mean square (RMS) roughness of the thin films was in the range of 0.2-3.2 nm. The results revealed that both of the magnetism and magneto optical Kerr (MOKE) spectra of Cox RE(1-x) Fe2O4 films could be mediated by doping with various RE ions. The Curie temperature of substituted samples was lower than pristine cobalt ferrite thin films. In MOKE spectra both dominant peaks were blue shifted with addition of RE ions. For low concentration dopant the inter-valence charge transfer related rotation was enhanced and for higher concentration dopant the crystal field rotation peak was enhanced. The MOKE enhancement for Eu3+ substituted samples was more than Nd3+ doped cobalt ferrite films. The enhanced MOKEs in nanocrystalline thin films might promise their applications for magneto-optical sensors in adopted wavelengths.

  14. Structural and morphological properties of ITO thin films grown by magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Ghorannevis, Z.; Akbarnejad, E.; Ghoranneviss, M.

    2015-10-01

    Physical properties of transparent and conducting indium tin oxide (ITO) thin films grown by radiofrequency (RF) magnetron sputtering are studied systematically by changing deposition time. The X-ray diffraction (XRD) data indicate polycrystalline thin films with grain orientations predominantly along the (2 2 2) and (4 0 0) directions. From atomic force microscopy (AFM) it is found that by increasing the deposition time, the roughness of the film increases. Scanning electron microscopy (SEM) images show a network of a high-porosity interconnected nanoparticles, which approximately have a pore size ranging between 20 and 30 nm. Optical measurements suggest an average transmission of 80 % for the ITO films. Sheet resistances are investigated using four-point probes, which imply that by increasing the film thickness the resistivities of the films decrease to 2.43 × 10-5 Ω cm.

  15. Structure, magnetic, and microwave properties of thick Ba-hexaferrite films epitaxially grown on GaN/Al2O3 substrates

    NASA Astrophysics Data System (ADS)

    Chen, Z.; Yang, A.; Mahalingam, K.; Averett, K. L.; Gao, J.; Brown, G. J.; Vittoria, C.; Harris, V. G.

    2010-06-01

    Thick barium hexaferrite [BaOṡ(Fe2O3)6] films, having the magnetoplumbite structure (i.e., Ba M), were epitaxially grown on c-axis oriented GaN/Al2O3 substrates by pulsed laser deposition followed by liquid phase epitaxy. X-ray diffraction showed (0,0,2n) crystallographic alignment with pole figure analyses confirming epitaxial growth. High resolution transmission electron microscopy images revealed magnetoplumbite unit cells stacked with limited interfacial mixing. Saturation magnetization, 4πMs, was measured for as-grown films to be 4.1±0.3 kG with a perpendicular magnetic anisotropy field of 16±0.3 kOe. Ferromagnetic resonance linewidth, the peak-to-peak power absorption derivative at 53 GHz, was 86 Oe. These properties will prove enabling for the integration of low loss Ba M ferrite microwave passive devices with active semiconductor circuit elements in systems-on-a-wafer architecture.

  16. Thermoelectric properties of epitaxial β-FeSi2 thin films grown on Si(111) substrates with various film qualities

    NASA Astrophysics Data System (ADS)

    Watanabe, Kentaro; Taniguchi, Tatsuhiko; Sakane, Shunya; Aoki, Shunsuke; Suzuki, Takeyuki; Fujita, Takeshi; Nakamura, Yoshiaki

    2017-05-01

    Si-based epitaxial β-FeSi2 thin films are attractive as materials for on-chip thermoelectric power generators. We investigated the structure, crystallinity, and thermoelectric properties of β-FeSi2 thin films epitaxially grown on Si(111) substrates by using three different techniques: conventional reactive deposition epitaxy followed by molecular beam epitaxy (RDE+MBE), solid phase epitaxy (SPE) based on codeposition of Fe and Si presented previously, and SPE followed by MBE (SPE+MBE) presented newly by this work. Their epitaxial growth temperatures were fixed at 530 °C for comparison. RDE+MBE thin films exhibited high crystalline quality, but rough surfaces and rugged β-FeSi2/Si(111) interfaces. On the other hand, SPE thin films showed flat surfaces and abrupt β-FeSi2/Si(111) interfaces but low crystallinity. We found that SPE+MBE thin films realized crystallinity higher than SPE thin films, and also had flatter surfaces and sharper interfaces than RDE+MBE thin films. In SPE+MBE thin film growth, due to the initial SPE process with low temperature codeposition, thermal interdiffusion of Fe and Si was suppressed, resulting in the surface flatness and abrupt interface. Second high temperature MBE process improved the crystallinity. We also investigated thermoelectric properties of these β-FeSi2 thin films. Structural factors affecting the thermoelectric properties of RDE+MBE, SPE, and SPE+MBE thin films were investigated.

  17. Characterization of PLD grown WO3 thin films for gas sensing

    NASA Astrophysics Data System (ADS)

    Boyadjiev, Stefan I.; Georgieva, Velichka; Stefan, Nicolaie; Stan, George E.; Mihailescu, Natalia; Visan, Anita; Mihailescu, Ion N.; Besleaga, Cristina; Szilágyi, Imre M.

    2017-09-01

    Tungsten trioxide (WO3) thin films were grown by pulsed laser deposition (PLD) with the aim to be applied in gas sensors. The films were studied by atomic force microscopy (AFM), X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy and profilometry. To study the gas sensing behavior of these WO3 films, they were deposited on quartz resonators and the quartz crystal microbalance (QCM) method was applied to analyze their gas sensitivity. Synthesis of tetragonal-WO3 films starting from a target with predominantly monoclinic WO3 phase was observed. The films deposited at 300 °C presented a surface topology favorable for the sorption properties, consisting of a film matrix with protruding craters/cavities. QCM prototype sensors with such films were tested for NO2 sensing. The PLD grown WO3 thin films show good sensitivity and fast reaction at room temperature, even in as-deposited state. With the presented technology, the manufacturing of QCM gas sensors is simple, fast and cost-effective, and it is also suitable for energy-effective portable equipment for on-line monitoring of environmental changes.

  18. Creatinine biomaterial thin films grown by laser techniques.

    PubMed

    György, E; Axente, E; Mihailescu, I N; Predoi, D; Ciuca, S; Neamtu, J

    2008-03-01

    Creatinine thin films were synthesised by matrix assisted pulsed laser deposition (PLD) techniques for enzyme-based biosensor applications. An UV KrF* (lambda=248 nm, tau approximately 10 ns) excimer laser source was used for the irradiation of the targets at incident fluence values in the 0.3-0.5 J/cm2 range. For the matrix assisted PLD the targets consisted on a frozen composite obtained by dissolving the biomaterials in distilled water. The surface morphology, chemical composition and structure of the obtained biomaterial thin films were investigated by scanning electron microscopy, Fourier transform infrared spectroscopy, and electron dispersive X-ray spectroscopy as a function of the target preparation procedure and incident laser fluence.

  19. Solid Lubrication of Laser Grown Fluorinated Diamond Thin Films

    DTIC Science & Technology

    1992-01-21

    irradiation of laser beam on the substrate surface 2 Schematic diagram showing laser CVD experimental set- up . 27 A single laser beam (YAG or Excimer) was only...0.05 to 0.2 depending upon temperature, environment, load, speed and presence of foreign material. Todate , ultra-low coefficients of friction (0.02...Laser technology for diamond film fabrication is very new and todate only a handful number of publications are available that address directly on the

  20. BiVO4 thin film photoanodes grown by chemical vapor deposition.

    PubMed

    Alarcón-Lladó, Esther; Chen, Le; Hettick, Mark; Mashouf, Neeka; Lin, Yongjing; Javey, Ali; Ager, Joel W

    2014-01-28

    BiVO4 thin film photoanodes were grown by vapor transport chemical deposition on FTO/glass substrates. By controlling the flow rate, the temperatures of the Bi and V sources (Bi metal and V2O5 powder, respectively), and the temperature of the deposition zone in a two-zone furnace, single-phase monoclinic BiVO4 thin films can be obtained. The CVD-grown films produce global AM1.5 photocurrent densities up to 1 mA cm(-2) in aqueous conditions in the presence of a sacrificial reagent. Front illuminated photocatalytic performance can be improved by inserting either a SnO2 hole blocking layer and/or a thin, extrinsically Mo doped BiVO4 layer between the FTO and the CVD-grown layer. The incident photon to current efficiency (IPCE), measured under front illumination, for BiVO4 grown directly on FTO/glass is about 10% for wavelengths below 450 nm at a bias of +0.6 V vs. Ag/AgCl. For BiVO4 grown on a 40 nm SnO2/20 nm Mo-doped BiVO4 back contact, the IPCE is increased to over 40% at wavelengths below 420 nm.

  1. Surface magnetic contribution in zinc ferrite thin films studied by element- and site-specific XMCD hysteresis-loops

    NASA Astrophysics Data System (ADS)

    Mendoza Zélis, P.; Pasquevich, G. A.; Salcedo Rodríguez, K. L.; Sánchez, F. H.; Rodríguez Torres, C. E.

    2016-12-01

    Element- and site-specific magnetic hysteresis-loops measurements on a zinc ferrite (ZnFe2O4) thin film were performed by X-ray magnetic circular dichroism. Results show that iron in octahedral and tetrahedral sites of spinel structure are coupled antiferromagnetically between them, and when magnetic field is applied the magnetic moment of the ion located at octahedral sites aligns along the field direction. The magnetic measurements reveal a distinctive response of the surface with in-plane anisotropy and an effective anisotropy constant value of 12.6 kJ/m3. This effective anisotropy is due to the combining effects of demagnetizing field and, volume and surface magnetic anisotropies KV =3.1 kJ/m3 and KS =16 μJ/m2.

  2. CdTe thin films grown by pulsed laser deposition using powder as target: Effect of substrate temperature

    NASA Astrophysics Data System (ADS)

    de Moure-Flores, F.; Quiñones-Galván, J. G.; Guillén-Cervantes, A.; Arias-Cerón, J. S.; Hernández-Hernández, A.; Santoyo-Salazar, J.; Santos-Cruz, J.; Mayén-Hernández, S. A.; de la L. Olvera, M.; Mendoza-Álvarez, J. G.; Meléndez-Lira, M.; Contreras-Puente, G.

    2014-01-01

    CdTe thin films were deposited by pulsed laser deposition on Corning glass slides using CdTe powder as target. Films were grown at substrate temperatures ranging from room temperature (~25 °C) to 300 °C. The structural, compositional and optical properties were analyzed as a function of substrate temperature. X-ray diffraction shows that CdTe films grown at room temperature have hexagonal phase, while for higher temperatures the films have cubic phase. Raman and EDS indicate that films grew with Te excess, which suggests that CdTe films have p-type conductivity.

  3. Effect of aluminium doping on zinc oxide thin films grown by spray pyrolysis

    NASA Astrophysics Data System (ADS)

    Manouni, A. El; Manjón, F. J.; Mollar, M.; Marí, B.; Gómez, R.; López, M. C.; Ramos-Barrado, J. R.

    2006-01-01

    We report the structural, optical, and electrical characterization of aluminium-doped zinc oxide thin films grown by the spray pyrolysis method. We report the effect of Al concentration on the resistivity and on the X-ray diffraction, transmittance, photoluminescence and Raman scattering spectra of the films. The minimum resistivity is obtained for the sample with nominal Al concentration of 1%. An increase of the Al doping decreases the quality of the films. The loss of short-range order affects the photoluminescence and resistivity, although the optical transmittance is good, and the decrease of the long-range order affects X-ray diffraction and Raman spectra.

  4. Self-assembled, nanostructured polypyrrole films grown in a high-gravity environment.

    PubMed

    Chang, Jean H; de Leon, Christian R Aleman; Hunter, Ian W

    2012-03-13

    A simple, novel method of synthesizing self-assembled, nanostructured conducting polymer films has been developed. Applying an increased centrifugal force on the electrodes during the electrochemical deposition process yields high surface area, micro- or nanostructured polymer films. Scanning electron microscopy showed that as the applied g-force increased, the polymers progressed from having smooth, "cauliflower" morphologies, to intermediate microstructured surfaces, to finally dense nanostructured surfaces with pore sizes as small as 50 nm. Cyclic voltammetry revealed that films grown at higher centrifugal accelerations (higher than 500g) exhibited less degradation after electrochemical cycling and more capacitive behavior.

  5. Fullerenelike arrangements in carbon nitride thin films grown by direct ion beam sputtering

    SciTech Connect

    Gago, R.; Abrasonis, G.; Muecklich, A.; Moeller, W.; Czigany, Zs.; Radnoczi, G.

    2005-08-15

    Carbon nitride (CN{sub x}) thin films were grown by direct N{sub 2}/Ar ion beam sputtering of a graphite target at moderate substrate temperatures (300-750 K). The resulting microstructure of the films was studied by high-resolution transmission electron microscopy. The images showed the presence of curved basal planes in fullerenelike arrangements. The achievement and evolution of these microstructural features are discussed in terms of nitrogen incorporation, film-forming flux, and ion bombardment effects, thus adding to the understanding of the formation mechanisms of curved graphitic structures in CN{sub x} materials.

  6. Investigation of Annealing Atmospheres on Physical Properties of Cigs Films Grown by Electrodeposition Technique

    NASA Astrophysics Data System (ADS)

    Adel, Chihi; Fethi, Boujmil Mohamed; Brahim, Bessais

    2016-02-01

    This study investigated the effect of different annealing conditions (influence of the annealing temperature and atmosphere) on structural, microstructure, optical and electrical properties of electrodeposited CuIn1-xGaxSe2 (CIGS) thin films. X-ray diffraction analysis exhibited all the samples have grown preferentially in the [112] crystal orientation with the chalcopyrite structure and without unwanted secondary CIGS phases. With the increase of annealing temperature, energy band gap of the CIGS film decrease from 1.32 to 1.12eV. The electrical properties of the films distinctly upgraded after annealing in nitrogen+ Se vapor, and worsened when annealed in vacuum.

  7. Adsorption of cobalt ferrite nanoparticles within layer-by-layer films: a kinetic study carried out using quartz crystal microbalance.

    PubMed

    Alcantara, Gustavo B; Paterno, Leonardo G; Afonso, André S; Faria, Ronaldo C; Pereira-da-Silva, Marcelo A; Morais, Paulo C; Soler, Maria A G

    2011-12-28

    The paper reports on the successful use of the quartz crystal microbalance technique to assess accurate kinetics and equilibrium parameters regarding the investigation of in situ adsorption of nanosized cobalt ferrite particles (CoFe(2)O(4)--10.5 nm-diameter) onto two different surfaces. Firstly, a single layer of nanoparticles was deposited onto the surface provided by the gold-coated quartz resonator functionalized with sodium 3-mercapto propanesulfonate (3-MPS). Secondly, the layer-by-layer (LbL) technique was used to build multilayers in which the CoFe(2)O(4) nanoparticle-based layer alternates with the sodium sulfonated polystyrene (PSS) layer. The adsorption experiments were conducted by modulating the number of adsorbed CoFe(2)O(4)/PSS bilayers (n) and/or by changing the CoFe(2)O(4) nanoparticle concentration while suspended as a stable colloidal dispersion. Adsorption of CoFe(2)O(4) nanoparticles onto the 3-MPS-functionalized surface follows perfectly a first order kinetic process in a wide range (two orders of magnitude) of nanoparticle concentrations. These data were used to assess the equilibrium constant and the adsorption free energy. Alternatively, the Langmuir adsorption constant was obtained while analyzing the isotherm data at the equilibrium. Adsorption of CoFe(2)O(4) nanoparticles while growing multilayers of CoFe(2)O(4)/PSS was conducted using colloidal suspensions with CoFe(2)O(4) concentration in the range of 10(-8) to 10(-6) (moles of cobalt ferrite per litre) and for different numbers of cycles n = 1, 3, 5, and 10. We found the adsorption of CoFe(2)O(4) nanoparticles within the CoFe(2)O(4)/PSS bilayers perfectly following a first order kinetic process, with the characteristic rate constant growing with the increase of CoFe(2)O(4) nanoparticle concentration and decreasing with the rise of the number of LbL cycles (n). Additionally, atomic force microscopy was employed for assessing the LbL film roughness and thickness. We found the film

  8. Properties of phosphorus-doped zinc oxide films grown by pulsed laser deposition

    SciTech Connect

    Li Yuanjie; Liu Zilong; Ren Jiangbo

    2011-05-15

    Electrical and chemical bonding properties of P-doped ZnO thin films grown by pulsed laser deposition on sapphire substrates were systematically characterized utilizing the Hall effect and x-ray photoelectron spectroscopy (XPS) measurements. Oxygen growth pressure and postannealing processing play a great role in the properties of these films. Increasing oxygen growth pressure from 5 to 20 Pa enhanced the resistivity of P-doped ZnO films by three orders of magnitude. P-doped ZnO films grown at 700 deg. C under 20 Pa O{sub 2} exhibited p-type conductivity with hole concentration of 5x10{sup 17} cm{sup -3} and hole mobility of 0.3 cm{sup 2}/V s. Rapid thermal annealing processing decreased the electron density in the P-doped ZnO films. XPS binding energies of P 2s and 2p peaks showed formation of P-O bonds which increased with oxygen pressure in the films. This indicates formation of defect complexes of P dopants occupying zinc sites P{sub Zn} and zinc vacancies V{sub Zn} in the P-doped ZnO films.

  9. RF Magnetron Sputtering Grown Cu2O Film Structural, Morphological, and Electrical Property Dependencies on Substrate Type.

    PubMed

    Ahn, Heejin; Um, Youngho

    2015-03-01

    We investigated the structural, morphological, and electrical properties of cuprous oxide (Cu2O) film dependency on substrate type. Thin films grown using RF magnetron sputtering were characterized by scanning electron microscopy, X-ray diffraction (XRD), and Hall effect measurements. Cu2O thin films were deposited onto sapphire (0001), Si (100), and MgO (110) substrates, and showed Cu2O single phase only, which was confirmed by XRD measurement. Relatively larger compressive strain existed in Cu2O film grown on sapphire and Si, while a smaller tensile strain appeared in Cu2O film grown on MgO. Cu2O thin film crystallite sizes showed a linear dependence on strain. Moreover, film carrier concentration and mobility increased with increasing strain, while resistivity decreased with decreasing strain. Cu2O film strain due to induced strain opens the possibility of controlling structural and electrical properties in device applications.

  10. Columnar structured FePt films epitaxially grown on large lattice mismatched intermediate layer

    NASA Astrophysics Data System (ADS)

    Dong, K. F.; Deng, J. Y.; Peng, Y. G.; Ju, G.; Chow, G. M.; Chen, J. S.

    2016-09-01

    The microstructure and magnetic properties of the FePt films grown on large mismatched ZrN (15.7%) intermediate layer were investigated. With using ZrN intermediate layer, FePt 10 nm films exhibited (001) texture except for some weaker FePt (110) texture. Good epitaxial relationships of FePt (001) <100>//ZrN (001) <100>//TiN (001) <100> among FePt and ZrN/TiN were revealed from the transmission electron microscopy (TEM) results. As compared with TiN intermediate layer, although FePt-SiO2-C films grown on ZrN/TiN intermediate layer showed isotropic magnetic properties, the large interfacial energy and lattice mismatch between FePt and ZrN would lead to form columnar structural FePt films with smaller grain size and improved isolation. By doping ZrN into the TiN layer, solid solution of ZrTiN was formed and the lattice constant is increased comparing with TiN and decreased comparing with ZrN. Moreover, FePt-SiO2-C films grown on TiN 2 nm-20 vol.% ZrN/TiN 3 nm intermediate layer showed an improved perpendicular magnetic anisotropy. Simultaneously, columnar structure with smaller grain size retained.

  11. Columnar structured FePt films epitaxially grown on large lattice mismatched intermediate layer

    PubMed Central

    Dong, K. F.; Deng, J. Y.; Peng, Y. G.; Ju, G.; Chow, G. M.; Chen, J. S.

    2016-01-01

    The microstructure and magnetic properties of the FePt films grown on large mismatched ZrN (15.7%) intermediate layer were investigated. With using ZrN intermediate layer, FePt 10 nm films exhibited (001) texture except for some weaker FePt (110) texture. Good epitaxial relationships of FePt (001) <100>//ZrN (001) <100>//TiN (001) <100> among FePt and ZrN/TiN were revealed from the transmission electron microscopy (TEM) results. As compared with TiN intermediate layer, although FePt-SiO2-C films grown on ZrN/TiN intermediate layer showed isotropic magnetic properties, the large interfacial energy and lattice mismatch between FePt and ZrN would lead to form columnar structural FePt films with smaller grain size and improved isolation. By doping ZrN into the TiN layer, solid solution of ZrTiN was formed and the lattice constant is increased comparing with TiN and decreased comparing with ZrN. Moreover, FePt-SiO2-C films grown on TiN 2 nm-20 vol.% ZrN/TiN 3 nm intermediate layer showed an improved perpendicular magnetic anisotropy. Simultaneously, columnar structure with smaller grain size retained. PMID:27686046

  12. Structural characterization of InSb thin films grown by electrodeposition

    SciTech Connect

    Singh, Joginder Rajaram, P.

    2015-06-24

    In the present work we have grown InSb thin films on brass substrates, using the electrodeposition technique. The electrochemical baths used in the growth were made up of aqueous solutions of InCl{sub 3} and SbCl{sub 3} mixed together in various proportions. The films grown were characterized by X-Ray diffraction (XRD), Scanning Electron Microscopy (SEM), and Energy Dispersive Analysis of X-rays (EDAX). Compositional studies show that stoichiometric InSb films can be prepared from a bath containing 0.05M InCl{sub 3} and 0.04M SbCl{sub 3}. XRD studies reveal that the films grown are polycrystalline having the zinc blende structure with (111) orientation. Crystallite size, dislocation density and strain were calculated using the XRD results. Optical transmission spectra were recorded using an FTIR spectrophotometer. The value of direct band gap was found to be around 0.20 eV for the thin films having the best stoichiometry.

  13. Columnar structured FePt films epitaxially grown on large lattice mismatched intermediate layer.

    PubMed

    Dong, K F; Deng, J Y; Peng, Y G; Ju, G; Chow, G M; Chen, J S

    2016-09-30

    The microstructure and magnetic properties of the FePt films grown on large mismatched ZrN (15.7%) intermediate layer were investigated. With using ZrN intermediate layer, FePt 10 nm films exhibited (001) texture except for some weaker FePt (110) texture. Good epitaxial relationships of FePt (001) <100>//ZrN (001) <100>//TiN (001) <100> among FePt and ZrN/TiN were revealed from the transmission electron microscopy (TEM) results. As compared with TiN intermediate layer, although FePt-SiO2-C films grown on ZrN/TiN intermediate layer showed isotropic magnetic properties, the large interfacial energy and lattice mismatch between FePt and ZrN would lead to form columnar structural FePt films with smaller grain size and improved isolation. By doping ZrN into the TiN layer, solid solution of ZrTiN was formed and the lattice constant is increased comparing with TiN and decreased comparing with ZrN. Moreover, FePt-SiO2-C films grown on TiN 2 nm-20 vol.% ZrN/TiN 3 nm intermediate layer showed an improved perpendicular magnetic anisotropy. Simultaneously, columnar structure with smaller grain size retained.

  14. Growth and high rate reactive ion etching of epitaxially grown barium hexaferrite films on single crystal silicon carbide substrates

    NASA Astrophysics Data System (ADS)

    Chen, Zhaohui

    Ferrites are an invaluable group of insulating magnetic materials used for high frequency microwave applications in such passive electronic devices as isolators, phase shifters, and circulators. Because of their high permeability, non-reciprocal electromagnetic properties, and low eddy current losses, there are no other materials that serve such a broad range of applications. Until recently, they have been widely employed in bulk form, with little success in thin film-based applications in commercial or military microwave technologies. In today's technology, emerging electronic systems, such as high frequency, high power wireless and satellite communications (GPS, Bluetooth, WLAN, commercial radar, etc) thin film materials are in high demand. It is widely recognized that as high frequency devices shift to microwave frequencies the integration of passive devices with semiconductor electronics holds significant advantages in the realization of miniaturization, broader bandwidths, higher performance, speed, power and lower production costs. Thus, the primary objective of this thesis is to explore the integration of ferrite films with wide band gap semiconductor substrates for the realization of monolithic integrated circuits (MICs). This thesis focuses on two key steps for the integration of barium hexaferrite (Ba M-type or BaM) devices on semiconductor substrates. First, the development of high crystal quality ferrite film growth via pulsed laser deposition on wide band gap silicon carbide semiconductor substrates, and second, the effective patterning of BaM films using dry etching techniques. To address part one, BaM films were deposited on 6H silicon carbide (0001) substrates by Pulsed Laser Deposition. X-ray diffraction showed strong crystallographic alignment while pole figures exhibited reflections consistent with epitaxial growth. After optimized annealing, BaM films have a perpendicular magnetic anisotropy field of 16,900 Oe, magnetization (4piMs) of 4.4 k

  15. Friction and wear properties of smooth diamond films grown in fullerene-argon plasmas

    SciTech Connect

    Erdemir, A.; Fenske, G.R.; Bindal, C.; Zuiker, C.; Krauss, A.R.; Gruen, D.M.

    1995-08-01

    In this study, we describe the growth mechanism and the ultralow friction and wear properties of smooth (20-50 nm rms) diamond films grown in a microwave plasma consisting of Ar and fullerene (the carbon source). The sliding friction coefficients of these films against Si{sub 3}N{sub 4} balls are 0.04 and 0.1 in dry N{sub 2} and air, which are comparable to that of natural diamond sliding against the same pin material, but is lower by factors of 5 to 10 than that afforded by rough diamond films grown in conventional H{sub 2}-CH{sub 4} plasmas. Furthermore, the smooth diamond films produced in this work afforded wear rates to Si{sub 3}N{sub 4} balls that were two to three orders of magnitude lower than those of H{sub 2}-CH{sub 4} grown films. Mechanistically, the ultralow friction and wear properties of the fullerene-derived diamond films correlate well with their initially smooth surface finish and their ability to polish even further during sliding. The wear tracks reach an ultrasmooth (3-6 nm rms) surface finish that results in very little abrasion and ploughing. The nanocrystalline microstructure and exceptionally pure sp{sup 3} bonding in these smooth diamond films were verified by numerous surface and structure analytical methods, including x-ray diffraction, high-resolution AF-S, EELS, NEXAFS, SEM, and TEM. An AFM instrument was used to characterize the topography of the films and rubbing surfaces.

  16. Observation of three crystalline layers in hydrothermally grown BiFeO{sub 3} thick films

    SciTech Connect

    Lee, T. K.; Sung, K. D.; Jung, J. H.; Kim, T. H.; Ko, J.-H.

    2014-11-21

    We report the observation of three different crystalline layers in hydrothermally grown BiFeO{sub 3} (BFO) thick films on SrRuO{sub 3}/SrTiO{sub 3} substrates. High-resolution X-ray diffraction and transmission electron microcopy results suggest that compressively strained, partially relaxed epitaxial layers, and a mixture of polycrystalline and amorphous BFO layers, were successively formed from the bottom to the top of the films. The resistance and capacitance of the mixed layer were significantly lower than those of the epitaxial layers. The atomic concentrations of Bi and Fe in the mixed layer were fluctuating for each point. Based on the observed three crystalline layers, we have discussed the growth mechanism and the leakage current of hydrothermally grown BFO thick films.

  17. Postannealing effects on undoped BaSi2 evaporated films grown on Si substrates

    NASA Astrophysics Data System (ADS)

    Suhara, Takamichi; Murata, Koichi; Navabi, Aryan; Hara, Kosuke O.; Nakagawa, Yoshihiko; Trinh, Cham Thi; Kurokawa, Yasuyoshi; Suemasu, Takashi; Wang, Kang L.; Usami, Noritaka

    2017-05-01

    Semiconducting BaSi2 is expected as an alternative material for solar cell application because of large absorption coefficients and a suitable bandgap for single-junction solar cells. In this study, the electrical properties of undoped BaSi2 films grown by a simple vacuum evaporation method are explored. The obtained results show that an undoped evaporated film is an n-type semiconductor with a high carrier density of ˜1019 cm-3 and exhibits a metallic behavior. The quality of BaSi2 films is significantly improved by postannealing at 1000 °C with surface covering to prevent oxidation. After annealing, the carrier density of BaSi2 films markedly decreases and the temperature dependence of carrier density changes from being metallic to being semiconducting. By comprehensive structural analysis, it is speculated that postannealing improves the film quality, for example, by decreasing the density of grain boundaries.

  18. Mechanically tunable magnetic properties of Fe81Ga19 films grown on flexible substrates

    NASA Astrophysics Data System (ADS)

    Dai, Guohong; Zhan, Qingfeng; Liu, Yiwei; Yang, Huali; Zhang, Xiaoshan; Chen, Bin; Li, Run-Wei

    2012-03-01

    We investigated on magnetic properties of magnetostrictive Fe81Ga19 films grown on flexible polyethylene terephthalate (PET) substrates under various mechanical strains. The unstrained Fe81Ga19 films exhibit a significant uniaxial magnetic anisotropy due to a residual stress in PET substrates. It was found that the squareness of hysteresis loops can be tuned by an application of strains, inward/compressive or outward/tensile bending of the films. A modified Stoner-Wohlfarth model with considering a distribution of easy axes in polycrystalline films was developed to account for the mechanically tunable magnetic properties in flexible Fe81Ga19 films. These results provide an alternative way to tune mechanically magnetic properties, which is particularly important for developing flexible magnetoelectronic devices.

  19. Multiple delta doping of single crystal cubic boron nitride films heteroepitaxially grown on (001)diamonds

    SciTech Connect

    Yin, H.; Ziemann, P.

    2014-06-23

    Phase pure cubic boron nitride (c-BN) films have been epitaxially grown on (001) diamond substrates at 900 °C. The n-type doping of c-BN epitaxial films relies on the sequential growth of nominally undoped (p-) and Si doped (n-) layers with well-controlled thickness (down to several nanometer range) in the concept of multiple delta doping. The existence of nominally undoped c-BN overgrowth separates the Si doped layers, preventing Si dopant segregation that was observed for continuously doped epitaxial c-BN films. This strategy allows doping of c-BN films can be scaled up to multiple numbers of doped layers through atomic level control of the interface in the future electronic devices. Enhanced electronic transport properties with higher hall mobility (10{sup 2} cm{sup 2}/V s) have been demonstrated at room temperature as compared to the normally continuously Si doped c-BN films.

  20. Mobility enhanced photoactivity in sol-gel grown epitaxial anatase TiO2 films.

    PubMed

    Jung, Hyun Suk; Lee, Jung-Kun; Lee, Jaegab; Kang, Bo Soo; Jia, Quanxi; Nastasi, Michael; Noh, Jun Hong; Cho, Chin-Moo; Yoon, Sung Hoon

    2008-03-18

    Epitaxial anatase thin films were grown on single-crystal LaAlO3 substrates by a sol-gel process. The epitaxial relationship between TiO2 and LaAlO3 was found to be [100]TiO2||[100]LaAlO3 and (001)TiO2||(001)LaAlO3 based on X-ray diffraction and a high-resolution transmission electron microscopy. The epitaxial anatase films show significantly improved photocatalytic properties, compared with polycrystalline anatase film on fused silica substrate. The increase in the photocatalytic activity of epitaxial anatase films is explained by enhanced charge carrier mobility, which is traced to the decreased grain boundary density in the epitaxial anatase film.

  1. Multiple delta doping of single crystal cubic boron nitride films heteroepitaxially grown on (001)diamonds

    NASA Astrophysics Data System (ADS)

    Yin, H.; Ziemann, P.

    2014-06-01

    Phase pure cubic boron nitride (c-BN) films have been epitaxially grown on (001) diamond substrates at 900 °C. The n-type doping of c-BN epitaxial films relies on the sequential growth of nominally undoped (p-) and Si doped (n-) layers with well-controlled thickness (down to several nanometer range) in the concept of multiple delta doping. The existence of nominally undoped c-BN overgrowth separates the Si doped layers, preventing Si dopant segregation that was observed for continuously doped epitaxial c-BN films. This strategy allows doping of c-BN films can be scaled up to multiple numbers of doped layers through atomic level control of the interface in the future electronic devices. Enhanced electronic transport properties with higher hall mobility (102 cm2/V s) have been demonstrated at room temperature as compared to the normally continuously Si doped c-BN films.

  2. Amorphous indium gallium zinc oxide thin film grown by pulse laser deposition technique

    SciTech Connect

    Mistry, Bhaumik V. Joshi, U. S.

    2016-05-23

    Highly electrically conducting and transparent in visible light IGZO thin film were grown on glass substrate at substrate temperature of 400 C by a pulse laser deposition techniques. Structural, surface, electrical, and optical properties of IGZO thin films were investigated at room temperature. Smooth surface morphology and amorphous nature of the film has been confirmed from the AFM and GIXRD analysis. A resistivity down to 7.7×10{sup −3} V cm was reproducibly obtained while maintaining optical transmission exceeding 70% at wavelengths from 340 to 780 nm. The carrier densities of the film was obtain to the value 1.9×10{sup 18} cm{sup 3}, while the Hall mobility of the IGZO thin film was 16 cm{sup 2} V{sup −1}S{sup −1}.

  3. Magnetic and transport properties of epitaxial thin film MgFe2O4 grown on MgO (100) by molecular beam epitaxy

    PubMed Central

    Wu, Han-Chun; Mauit, Ozhet; Coileáin, Cormac Ó; Syrlybekov, Askar; Khalid, Abbas; Mouti, Anas; Abid, Mourad; Zhang, Hong-Zhou; Abid, Mohamed; Shvets, Igor V.

    2014-01-01

    Magnesium ferrite is a very important magnetic material due to its interesting magnetic and electrical properties and its chemical and thermal stability. Here we report on the magnetic and transport properties of epitaxial MgFe2O4 thin films grown on MgO (001) by molecular beam epitaxy. The structural properties and chemical composition of the MgFe2O4 films were characterized by X-Ray diffraction and X-Ray photoelectron spectroscopy, respectively. The nonsaturation of the magnetization in high magnetic fields observed for M (H) measurements and the linear negative magnetoresistance (MR) curves indicate the presence of anti-phase boundaries (APBs) in MgFe2O4. The presence of APBs was confirmed by transmission electron microscopy. Moreover, post annealing decreases the resistance and enhances the MR of the film, suggesting migration of the APBs. Our results may be valuable for the application of MgFe2O4 in spintronics. PMID:25388355

  4. Epitaxial Garnets and Hexagonal Ferrites.

    DTIC Science & Technology

    1982-04-20

    Iron Garnet Liquid Phase Epitaxy Hexagonal Ferrite microwave Signal Processing Millimeter-Wave 20. ABSTRACT (Continue ani revee arde if necoeermy and...le.’uIfy by block rns.) e objective of this research is to develop new and improved epitauial ferrite materials for use in microwave and millimeter... ferrite films suitable for microwave and millimeter-wave signal processing at frequencies above 1 GHz. The specific tasks are: a. Analyze and develop

  5. Superconducting YBa 2Cu 3O 7- δ thin film grown on metallic film evaporated on MgO

    NASA Astrophysics Data System (ADS)

    Verdyan, A.; Azoulay, J.; Lapsker, I.

    2001-03-01

    At present it is commonly accepted that thin film formation of YBa 2Cu 3O 7- δ (YBCO) on conducting substrate is one of the keys to further development of advanced devices in the microelectronic and other applications. We have grown YBCO thin films by resistive evaporation technique on MgO coated with metallic layers (Ni or Ag). A simple inexpensive vacuum system equipped with resistively heated boats for metal and precursor mixture of yttrium, copper and barium fluoride powders was used. X-ray diffraction (XRD) and scanning electron microscopy techniques were used for texture, morphology and surface analyses respectively. Electrical and magnetical properties were determined by a standard dc four-probe method. The way of heating process is shown to be critical parameter in the film quality. The physical and electrical properties of the YBCO films are discussed in light of the fact that XRD measurements done on the metallic buffer layers have revealed a multicrystalline structure.

  6. Influence of CrO/sub 4//sup 2 -/, MoO/sub 4//sup 2 -/, and WO/sub 4//sup 2 -/ ions on the composition of the passive films on ferritic stainless steels

    SciTech Connect

    Baron, J.; Freeman, G.B.; Gluszek, J.; Kubicki, J.; Masalski, J.

    1987-09-01

    The passive films existing on ferritic stainless steel were modified by exposure of the samples to solutions containing CrO/sub 4//sup 2 -/, MoO/sub 4//sup 2 -/, or WO/sub 4//sup 2 -/. The films were analyzed by Auger spectroscopy. Changes in film composition are discussed.

  7. Effects of Growth Temperature on Epitaxial Thin Films of Vanadium Dioxide Grown by Pulsed Laser Deposition

    SciTech Connect

    Nag, Joyeeta; HaglundJr., Richard F; Payzant, E Andrew

    2011-01-01

    Stoichiometric vanadium dioxide in all of its bulk, thin film and nanostructured forms exhibits an insulator-to-metal transition (IMT) accompanied by structural change, induced by various physical and chemical stimuli such as temperature, ultrashort light pulses, electric field, doping or strain. In these applications, the optical qualities of the films are of paramount importance, but are often highly variable depending on fabrication procedure. We have grown epitaxial films of vanadium dioxide on c-plane (0001) of sapphire using two different procedures involving room temperature growth followed by annealing and direct high temperature growth. Strain at the interface of the substrate and the film due to growth at different temperatures leads to significant differences in morphologies and phase transition characteristics. We present a comparative study of the morphologies and switching characteristics of the two films and conclude that contrary to conventional wisdom, the room-temperature grown films have smoother, more continuous morphologies and better switching performance. Our observation is supported by theoretical and experimental studies of epitaxial growth of semiconductors.

  8. Amorphous Silicon Nanowires Grown on Silicon Oxide Film by Annealing

    NASA Astrophysics Data System (ADS)

    Yuan, Zhishan; Wang, Chengyong; Chen, Ke; Ni, Zhonghua; Chen, Yunfei

    2017-08-01

    In this paper, amorphous silicon nanowires (α-SiNWs) were synthesized on (100) Si substrate with silicon oxide film by Cu catalyst-driven solid-liquid-solid mechanism (SLS) during annealing process (1080 °C for 30 min under Ar/H2 atmosphere). Micro size Cu pattern fabrication decided whether α-SiNWs can grow or not. Meanwhile, those micro size Cu patterns also controlled the position and density of wires. During the annealing process, Cu pattern reacted with SiO2 to form Cu silicide. More important, a diffusion channel was opened for Si atoms to synthesis α-SiNWs. What is more, the size of α-SiNWs was simply controlled by the annealing time. The length of wire was increased with annealing time. However, the diameter showed the opposite tendency. The room temperature resistivity of the nanowire was about 2.1 × 103 Ω·cm (84 nm diameter and 21 μm length). This simple fabrication method makes application of α-SiNWs become possible.

  9. Amorphous Silicon Nanowires Grown on Silicon Oxide Film by Annealing.

    PubMed

    Yuan, Zhishan; Wang, Chengyong; Chen, Ke; Ni, Zhonghua; Chen, Yunfei

    2017-08-10

    In this paper, amorphous silicon nanowires (α-SiNWs) were synthesized on (100) Si substrate with silicon oxide film by Cu catalyst-driven solid-liquid-solid mechanism (SLS) during annealing process (1080 °C for 30 min under Ar/H2 atmosphere). Micro size Cu pattern fabrication decided whether α-SiNWs can grow or not. Meanwhile, those micro size Cu patterns also controlled the position and density of wires. During the annealing process, Cu pattern reacted with SiO2 to form Cu silicide. More important, a diffusion channel was opened for Si atoms to synthesis α-SiNWs. What is more, the size of α-SiNWs was simply controlled by the annealing time. The length of wire was increased with annealing time. However, the diameter showed the opposite tendency. The room temperature resistivity of the nanowire was about 2.1 × 10(3) Ω·cm (84 nm diameter and 21 μm length). This simple fabrication method makes application of α-SiNWs become possible.

  10. High magnetization and the high-temperature superparamagnetic transition with intercluster interaction in disordered zinc ferrite thin film.

    PubMed

    Nakashima, Seisuke; Fujita, Koji; Tanaka, Katsuhisa; Hirao, Kazuyuki

    2005-01-12

    Magnetic properties have been investigated for a zinc ferrite thin film deposited on glass at a substrate temperature close to room temperature using a sputtering method. X-ray diffraction analysis reveals that the thin film consists of nanocrystalline ZnFe(2)O(4) with the size of approximately 10 nm. The magnetization at 300 K as a function of the external magnetic field shows ferrimagnetic behaviour, and tends to be saturated to the high value of 32 emu g(-1) when the external magnetic field is higher than 30 kOe. It is considered that the preparation of the ZnFe(2)O(4) thin film by the sputtering method, which involves very rapid cooling of vapour to form the solid-state phase, causes the random distribution of Zn(2+) and Fe(3+) ions in the spinel structure. In such a situation, Fe(3+) ions occupy both octahedral and tetrahedral sites, and the strong superexchange interaction among them gives rise to ferrimagnetic properties accompanied with high magnetization. The static and dynamic magnetic responses, such as the frequency dependence of the linear ac susceptibility, the temperature dependence of the nonlinear ac susceptibility, the discrepancy between the zero-field-cooled (ZFC) and field-cooled dc magnetizations, and the relaxation of the ZFC magnetization, demonstrate that the magnetism of the present thin film is attributable to the superparamagnetism with the interaction among magnetic clusters. Spin freezing occurs at a temperature higher than room temperature ([Formula: see text] K).

  11. Observation of longitudinal spin-Seebeck effect in cobalt-ferrite epitaxial thin films

    NASA Astrophysics Data System (ADS)

    Niizeki, Tomohiko; Kikkawa, Takashi; Uchida, Ken-ichi; Oka, Mineto; Suzuki, Kazuya Z.; Yanagihara, Hideto; Kita, Eiji; Saitoh, Eiji

    2015-05-01

    The longitudinal spin-Seebeck effect (LSSE) has been investigated in cobalt ferrite (CFO), an exceptionally hard magnetic spinel ferrite. A bilayer of a polycrystalline Pt and an epitaxially-strained CFO(110) exhibiting an in-plane uniaxial anisotropy was prepared by reactive rf sputtering technique. Thermally generated spin voltage in the CFO layer was measured via the inverse spin-Hall effect in the Pt layer. External-magnetic-field (H) dependence of the LSSE voltage (VLSSE) in the Pt/CFO(110) sample with H ∥ [001] was found to exhibit a hysteresis loop with a high squareness ratio and high coercivity, while that with H ∥ [ 1 1 ¯ 0 ] shows a nearly closed loop, reflecting the different anisotropies induced by the epitaxial strain. The magnitude of VLSSE has a linear relationship with the temperature difference (ΔT), giving the relatively large VLSSE /ΔT of about 3 μV/K for CFO(110) which was kept even at zero external field.

  12. Observation of longitudinal spin-Seebeck effect in cobalt-ferrite epitaxial thin films

    SciTech Connect

    Niizeki, Tomohiko; Kikkawa, Takashi; Uchida, Ken-ichi; Oka, Mineto; Suzuki, Kazuya Z.; Yanagihara, Hideto; Kita, Eiji; Saitoh, Eiji

    2015-05-15

    The longitudinal spin-Seebeck effect (LSSE) has been investigated in cobalt ferrite (CFO), an exceptionally hard magnetic spinel ferrite. A bilayer of a polycrystalline Pt and an epitaxially-strained CFO(110) exhibiting an in-plane uniaxial anisotropy was prepared by reactive rf sputtering technique. Thermally generated spin voltage in the CFO layer was measured via the inverse spin-Hall effect in the Pt layer. External-magnetic-field (H) dependence of the LSSE voltage (V{sub LSSE}) in the Pt/CFO(110) sample with H ∥ [001] was found to exhibit a hysteresis loop with a high squareness ratio and high coercivity, while that with H∥[11{sup -}0] shows a nearly closed loop, reflecting the different anisotropies induced by the epitaxial strain. The magnitude of V{sub LSSE} has a linear relationship with the temperature difference (ΔT), giving the relatively large V{sub LSSE} /ΔT of about 3 μV/K for CFO(110) which was kept even at zero external field.

  13. Two-dimensional Covalent Organic Framework Thin Films Grown in Flow.

    PubMed

    Bisbey, Ryan P; DeBlase, Catherine R; Smith, Brian J; Dichtel, William R

    2016-09-14

    Two-dimensional covalent organic frameworks (2D COFs) are crystalline polymer networks whose modular 2D structures and permanent porosity motivate efforts to integrate them into sensing, energy storage, and optoelectronic devices. These applications require forming the material as a thin film instead of a microcrystalline powder, which has been achieved previously by including a substrate in the reaction mixture. This approach suffers from two key drawbacks: COF precipitates form concurrently and contaminate the film, and variable monomer and oligomer concentrations during the polymerization provide poor control over film thickness. Here we address these challenges by growing 2D COF thin films under continuous flow conditions. Initially homogeneous monomer solutions polymerize while pumped through heated tubing for a given residence time, after which they pass over a substrate. When the residence time and conditions are chosen judiciously, 2D COF powders form downstream of the substrate, and the chemical composition of the solution at the substrate remains constant. COF films grown in flow exhibit constant rates of mass deposition, enabling thickness control as well as access to thicker films than are available from previous static growth procedures. Notably, the crystallinity of COF films is observed only at longer residence times, suggesting that oligomeric and polymeric species play an important role in forming the 2D COF lattice. This approach, which we demonstrate for four different frameworks, is both a simple and powerful method to control the formation of COF thin films.

  14. Structure and Morphology of Phthalocyanine Films Grown in Electrical Fields by Vapor Deposition

    NASA Technical Reports Server (NTRS)

    Zhu, Shen; Banks, Curtis E.; Frazier, Donald O.; Penn, Benjamin; Abdeldayem, Hossin; Hicks, Roslin

    1999-01-01

    Phthalocyanine is a very stable organic material in the atmosphere and has been used in numerous applications, such as optical switching and optical storage devices. Although this material has already been discovered for several decades and has had extensive studies conducted on it, many properties still need to be better understood, for example, the mechanisms of forming different solid phases and of changing film morphology by external forces. Phthalocyanine has two preferred solid phases (alpha and beta phases) for which the crystal structures, surface morphology and optical properties are different. In order to investigate these phenomena and the relationship among them, phthalocyanine films have been synthesized by vapor deposition on quartz substrates with and without an external electrical field. Some substrates were coated with a very thin gold film for the electrical field. These films have been characterized using x-ray diffraction, scanning electron microscopy, Fourier transfer infrared spectroscopy, and Z-scan technique. The films have excellent chemical and thermal stability. However, the surface of these films grown without the electrical field shows flower-like morphology. When films are deposited under an electrical field (approximately 3000 V/cm), an aligned structure is revealed on the surface. A comparison of the structure, morphology, optical properties, and the growth mechanism for these films with and without an electrical field will be discussed.

  15. Microwave-assisted nonaqueous sol-gel deposition of different spinel ferrites and barium titanate perovskite thin films.

    PubMed

    Kubli, Martin; Luo, Li; Bilecka, Idalia; Niederberger, Markus

    2010-01-01

    Rapid and selective heating of solvents by microwave irradiation coupled to nonaqueous sol-gel chemistry makes it possible to simultaneously synthesize metal oxide nanoparticles within minutes and deposit them on substrates. The simple immersion of substrates, such as glass slides, in the reaction solution results after microwave heating in the deposition of homogeneous porous thin films whose thickness can be adjusted through the precursor concentration. Here we use such a microwave-assisted nonaqueous sol-gel process for the formation of various spinel ferrite MFe2O4 (M = Fe, Co, Mn, Ni) and BaTiO3 nanoparticles and their deposition as thin films. The approach offers high flexibility with respect to controlling the crystal size by adjusting the reaction time and/or temperature. Based on the example of CoFe2O4 nanoparticles, we show how the crystal size can carefully be tuned from 4 to 8 nm, resulting in a continuous change of the magnetic properties.

  16. Preparation and characterization of LaMnO3 thin films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Aruta, C.; Angeloni, M.; Balestrino, G.; Boggio, N. G.; Medaglia, P. G.; Tebano, A.; Davidson, B.; Baldini, M.; Di Castro, D.; Postorino, P.; Dore, P.; Sidorenko, A.; Allodi, G.; De Renzi, R.

    2006-07-01

    We have grown LaMnO3 thin films on (001) LaAlO3 substrates by pulsed laser deposition. X-ray diffraction confirms that the films are only slightly relaxed and are oriented "square on square" relative to the substrate. The measured Raman spectra closely resemble that observed in bulk LaMnO3, which indicates no relevant distortions of the MnO6 octahedra induced by the epitaxial strain. Therefore, no detectable changes in the lattice dynamics occurred in our LaMnO3 strained films relative to the bulk case. Mn55 nuclear magnetic resonance identifies the presence of localized Mn4+ states. Superconducting quantum interference device magnetization measures TN=131(3)K and a saturation moment μ =1.09μB/Mn, revealing a small concentration of Mn4+ and placing our films within the antiferromagnetic insulating phase.

  17. Tunability of the superconductivity of tungsten films grown by focused-ion-beam direct writing

    NASA Astrophysics Data System (ADS)

    Li, Wuxia; Fenton, J. C.; Wang, Yiqian; McComb, D. W.; Warburton, P. A.

    2008-11-01

    We have grown tungsten-containing films by focused-ion-beam (FIB)-induced chemical vapor deposition. The films lie close to the metal-insulator transition with an electrical conductivity which changes by less than 5% between room temperature and 7 K. The superconducting transition temperature Tc of the films can be controlled between 5.0 and 6.2 K by varying the ion-beam deposition current. The Tc can be correlated with how far the films are from the metal-insulator transition, showing a nonmonotonic dependence, which is well described by the heuristic model of [Osofsky et al., Phys. Rev. Lett. 87, 197004 (2001)]. Our results suggest that FIB direct-writing of W composites might be a potential approach to fabricate mask-free superconducting devices as well as to explore the role of reduced dimensionality on superconductivity.

  18. Electrical transport and magnetic properties of epitaxial LSMO films grown on STO substrates

    NASA Astrophysics Data System (ADS)

    Yuan, Wei; Zhao, Yuelei; Su, Tang; Song, Qi; Han, Wei; Shi, Jing

    2015-03-01

    La0.7Sr0.3MnO3 (LSMO) is a very attractive material for spintronics due to its half-metallic ferromagnetic properties. The LSMO films are epitaxially grown on STO (100) substrates using pulsed laser deposition. The effects of substrate temperature, laser power, oxygen pressure, and annealing on the LSMO growth are systematically investigated by the reflection high energy electron diffraction and atomic force microscopy. Under the optimized growth condition, we have achieved atomically flat LSMO thin films with a wide terrace width of more than 5 micro-meters. The electrical transport properties of LSMO thin films of various thicknesses ranging from 8 to 20 monolayers are studied by measuring the resistivity as a function of temperature. We find that the growth condition plays an important role in the critical film thickness for the metal-insulator transition and the Curie temperature. The Ministry of Science and Technology of China.

  19. Highly crystalline MoS{sub 2} thin films grown by pulsed laser deposition

    SciTech Connect

    Serrao, Claudy R.; You, Long; Gadgil, Sushant; Hu, Chenming; Salahuddin, Sayeef; Diamond, Anthony M.; Hsu, Shang-Lin; Clarkson, James; Carraro, Carlo; Maboudian, Roya

    2015-02-02

    Highly crystalline thin films of MoS{sub 2} were prepared over large area by pulsed laser deposition down to a single monolayer on Al{sub 2}O{sub 3} (0001), GaN (0001), and SiC-6H (0001) substrates. X-ray diffraction and selected area electron diffraction studies show that the films are quasi-epitaxial with good out-of-plane texture. In addition, the thin films were observed to be highly crystalline with rocking curve full width half maxima of 0.01°, smooth with a RMS roughness of 0.27 nm, and uniform in thickness based on Raman spectroscopy. From transport measurements, the as-grown films were found to be p-type.

  20. p-Type zinc oxide films grown by infrared-light-assisted pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Hiraide, Toshihiro; Kurumi, Satoshi; Suzuki, Kaoru

    2013-03-01

    In this paper, ZnO films were grown on sapphire (0001) substrates by infrared-light-assisted pulsed-laser deposition (IRA-PLD). In addition, a nitrogen-plasma-assisted (PA-N) system was utilized for effectively doping the acceptor by radio frequency induction coupled plasma (RF-ICP). The effect of IRA-PLD and PA-N systems was investigated by studying the difference in substrate temperature with and without plasma assistance. We found that ZnO films exhibit no exciton emission with PA-N at a high temperature and that an increase in the substrate temperature yields ZnO films with a (002) and c-axis preferred orientation in a nitrogen (N2) gas atmosphere. ZnO films are changed from n-type to p-type at a substrate temperature of 673 K by IRA-PLD with an N2 background atmosphere.

  1. Crystalline phase in Alq3 films grown by the hot-wall method

    NASA Astrophysics Data System (ADS)

    Seto, Satoru; Yamada, Satoru; Kitazaki, Asami; Sebald, Kathrin; Rückmann, Ilja; Gutowski, Jürgen

    2011-03-01

    We deposited tris-(8-hydroxyquinoline) aluminum (Alq3) films on glass substrates by using the hot-wall method. The Alq3 films were deposited for changing substrate temperature from 50 to 125 °C. With increasing the substrate temperature, anomalous growth patterns with a butterfly-like shape appeared and spread on the surface of the deposited films. The intensity of emission from the anomalous region is stronger than that from the smooth region as found by fluorescence microscope observations and photoluminescence measurements. The observed anomalous growth in the films deposited at high substrate temperatures was identified to be due to α-phase crystallization of Alq3 from the emission spectrum and X-ray diffraction measurements and from comparing those results with α-Alq3 crystals grown by the vapour phase growth technique.

  2. Physical and tribological properties of diamond films grown in argon-carbon plasmas

    SciTech Connect

    Zuiker, C.; Krauss, A.R.; Gruen, D.M.; Pan, X.; Li, J.C.; Csencsits, R.; Erdemir, A.; Bindal, C.; Fenske, G.

    1995-06-01

    Nanocrystalline diamond films have been deposited using a microwave plasma consisting of argon, 2--10% hydrogen and a carbon precursor such as C{sub 60} or CH{sub 4}. It was found that it is possible to grow the diamond phase with both carbon precursors, although the hydrogen concentration in the plasma was 1--2 orders of magnitude lower than normally required in the absence of the argon. Auger electron spectroscopy, x-ray diffraction measurements and transmission electron microscopy indicate the films are predominantly composed of diamond. Surface roughness, as determined by atomic force microscopy and scanning electron microscopy indicate the nanocrystalline films grown in low hydrogen content plasmas grow exceptionally smooth (30--50 nm) to thicknesses of 10 {mu}m. The smooth nanocrystalline films result in low friction coefficients ({mu}=0.04--0.06) and low average wear rates as determined by pin-on-disk measurements.

  3. Structural and magnetic properties of epitaxially grown MnAs films on GaAs(110)

    NASA Astrophysics Data System (ADS)

    Kolovos-Vellianitis, D.; Herrmann, C.; Däweritz, L.; Ploog, K. H.

    2005-08-01

    MnAs films were grown by molecular beam epitaxy (MBE) on GaAs(110) substrates, since this orientation was recently identified as promising for the increase of spin lifetimes in semiconductor heterojunctions, which is of interest in spin injection experiments. A single epitaxial orientation was revealed for the MnAs films which consist of both the ferromagnetic, hexagonal α-MnAs and the paramagnetic, orthorhombic β-MnAs phase at room temperature. This phase coexistence could be imaged as a well ordered stripe pattern, whose periodicity depends on the film thickness. The study of the ferromagnetic properties shows a strong influence of the film thickness on the measured coercive fields and saturation magnetizations.

  4. Structural and magnetic properties of epitaxially grown MnAs films on GaAs(110)

    SciTech Connect

    Kolovos-Vellianitis, D.; Herrmann, C.; Daeweritz, L.; Ploog, K.H.

    2005-08-29

    MnAs films were grown by molecular beam epitaxy (MBE) on GaAs(110) substrates, since this orientation was recently identified as promising for the increase of spin lifetimes in semiconductor heterojunctions, which is of interest in spin injection experiments. A single epitaxial orientation was revealed for the MnAs films which consist of both the ferromagnetic, hexagonal {alpha}-MnAs and the paramagnetic, orthorhombic {beta}-MnAs phase at room temperature. This phase coexistence could be imaged as a well ordered stripe pattern, whose periodicity depends on the film thickness. The study of the ferromagnetic properties shows a strong influence of the film thickness on the measured coercive fields and saturation magnetizations.

  5. Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)

    SciTech Connect

    Bertram, F.; Deiter, C.; Schemme, T.; Jentsch, S.; Wollschlaeger, J.

    2013-05-14

    Magnetite ultrathin films were grown using different deposition rates and substrate temperatures. The structure of these films was studied using (grazing incidence) x-ray diffraction, while their surface structure was characterized by low energy electron diffraction. In addition to that, we performed x-ray photoelectron spectroscopy and magneto optic Kerr effect measurements to probe the stoichiometry of the films as well as their magnetic properties. The diffraction peaks of the inverse spinel structure, which originate exclusively from Fe ions on tetrahedral sites are strongly affected by the preparation conditions, while the octahedral sites remain almost unchanged. With both decreasing deposition rate as well as decreasing substrate temperature, the integrated intensity of the diffraction peaks originating exclusively from Fe on tetrahedral sites is decreasing. We propose that the ions usually occupying tetrahedral sites in magnetite are relocated to octahedral vacancies. Ferrimagnetic behaviour is only observed for well ordered magnetite films.

  6. Diamond thin films grown by microwave plasma assisted chemical vapor deposition

    SciTech Connect

    Leksono, M.

    1991-09-05

    Undoped and boron doped diamond thin films have been successfully grown by microwave plasma chemical vapor deposition from CH{sub 4}, H{sub 2}, and B{sub 2}H{sub 6}. The films were characterized using x- ray diffraction techniques, Raman and infrared spectroscopies, scanning electron microscopy, secondary ion mass spectrometry, and various electrical measurements. The deposition rates of the diamond films were found to increase with the CH{sub 4} concentration, substrate temperature, and/or pressure, and at 1.0% methane, 900{degrees}C, and 35 Torr, the value was measured to be 0.87 {mu}m/hour. The deposition rate for boron doped diamond films, decreases as the diborane concentration increases. The morphologies of the undoped diamond films are strongly related to the deposition parameters. As the temperature increases from 840 to 925 C, the film morphology changes from cubo-octahedron to cubic structures, while as the CH{sub 4} concentration increases from 0.5 to 1.0%, the morphology changes from triangular (111) faces with a weak preferred orientation to square (100) faces. At 2.0% Ch{sub 4} or higher the films become microcrystalline with cauliflower structures. Scanning electron microscopy analyses also demonstrate that selective deposition of undoped diamond films has been successfully achieved using a lift-off process with a resolution of at least 2 {mu}m. The x-ray diffraction and Raman spectra demonstrate that high quality diamond films have been achieved. The concentration of the nondiamond phases in the films grown at 1.0% CH{sub 4} can be estimated from the Raman spectra to be at less than 0.2% and increases with the CH{sub 4} concentration. The Raman spectra of the boron doped diamond films also indicate that the presence of boron tends to suppress the nondiamond phases in the films. Infrared spectra of the undoped diamond films show very weak CH stretch peaks which suggest that the hydrogen concentration is very low.

  7. Martensite transformations in Mn2NiGa thin films grown on GaAs substrates

    NASA Astrophysics Data System (ADS)

    Schaefer, D. M.; Neckel, I. T.; Mazzaro, I.; Graff, I. L.; Varalda, J.; Schreiner, W. H.; Mosca, D. H.

    2016-11-01

    The purpose of this work is to investigate the correlation between magnetism and crystallographic structures of Mn2NiGa thin films grown by molecular beam epitaxy on GaAs(1 1 1) and GaAs(0 0 1) surfaces. The films present themselves with thermoelastic martensitic transformations upon cooling, and heating with high-temperature leads to austenite structures exhibiting a preferable (1 1 0) texture. X-ray diffraction measurements performed as a function of temperature reveal three different types of domain variants in the films within a large interval of temperatures. The austenite structures with lattice parameters ranging from 0.574 nm to 0.601 nm undergo volume conserving structural transitions to martensite with a c/a ratio of 1.2. The coexistence of variants with different domain configurations is induced on each GaAs substrate. Although the Curie temperatures (~360 K) are similar for films grown on GaAs(1 1 1) and GaAs (0 0 1) substrates, their saturation magnetizations are respectively 18 kA m-1 and 8 kA m-1 at room temperature and exhibit quite different magnetic irreversibility behaviors. Our results indicate that a multiplicity of possible equivalent variant domains on the GaAs surfaces makes it difficult to stabilize epitaxial films on these substrates.

  8. Uniform GaN thin films grown on (100) silicon by remote plasma atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Shih, Huan-Yu; Lin, Ming-Chih; Chen, Liang-Yih; Chen, Miin-Jang

    2015-01-01

    The growth of uniform gallium nitride (GaN) thin films was reported on (100) Si substrate by remote plasma atomic layer deposition (RP-ALD) using triethylgallium (TEG) and NH3 as the precursors. The self-limiting growth of GaN was manifested by the saturation of the deposition rate with the doses of TEG and NH3. The increase in the growth temperature leads to the rise of nitrogen content and improved crystallinity of GaN thin films, from amorphous at a low deposition temperature of 200 °C to polycrystalline hexagonal structures at a high growth temperature of 500 °C. No melting-back etching was observed at the GaN/Si interface. The excellent uniformity and almost atomic flat surface of the GaN thin films also infer the surface control mode of the GaN thin films grown by the RP-ALD technique. The GaN thin films grown by RP-ALD will be further applied in the light-emitting diodes and high electron mobility transistors on (100) Si substrate.

  9. RBS study of in situ grown BiSrCaCuO films

    NASA Astrophysics Data System (ADS)

    Ranno, L.; Perrière, J.; Enard, J. P.; Kerhervé, F.; Laurent, A.; Perez Casero, R.

    1992-07-01

    BiSrCaCuO thin films have been grown in situ on MgO single crystals by pulsed laser deposition under 0.1 mbar oxygen pressure, the substrate temperature being around 700°C. These films are nearly pure 2212 phase, highly textured with a full c-axis orientation, and Rutherford backscattering spectrometry (RBS) in channeling geometry has been used to obtain precise information on their crystallinity. Although the X min values were found higher (about 35%) than those measured on bulk single crystals, they show partial epitaxy of the films, which was not observed with post annealed films. The comparison of backscattering yield in random and aligned orientations evidences the fact that all the cationic elements behave in a similar way in the channeling experiments, while differences are observed for the oxygen species according to their precise location in the network. These in situ grown films were found very sensitive to the ion irradiation, and showed large dechanneling effect with increasing ion dosis.

  10. Group III-nitride thin films grown using MBE and bismuth

    DOEpatents

    Kisielowski, Christian K.; Rubin, Michael

    2000-01-01

    The present invention comprises growing gallium nitride films in the presence of bismuth using MBE at temperatures of about 1000 K or less. The present invention further comprises the gallium nitride films fabricated using the inventive fabrication method. The inventive films may be doped with magnesium or other dopants. The gallium nitride films were grown on sapphire substrates using a hollow anode Constricted Glow Discharge nitrogen plasma source. When bismuth was used as a surfactant, two-dimensional gallium nitride crystal sizes ranging between 10 .mu.m and 20 .mu.m were observed. This is 20 to 40 times larger than crystal sizes observed when GaN films were grown under similar circumstances but without bismuth. It is thought that the observed increase in crystal size is due bismuth inducing an increased surface diffusion coefficient for gallium. The calculated value of 4.7.times.10.sup.-7 cm.sup.2 /sec. reveals a virtual substrate temperature of 1258 K which is 260 degrees higher than the actual one.

  11. Group III-nitride thin films grown using MBE and bismuth

    DOEpatents

    Kisielowski, Christian K.; Rubin, Michael

    2002-01-01

    The present invention comprises growing gallium nitride films in the presence of bismuth using MBE at temperatures of about 1000 K or less. The present invention further comprises the gallium nitride films fabricated using the inventive fabrication method. The inventive films may be doped with magnesium or other dopants. The gallium nitride films were grown on sapphire substrates using a hollow anode Constricted Glow Discharge nitrogen plasma source. When bismuth was used as a surfactant, two-dimensional gallium nitride crystal sizes ranging between 10 .mu.m and 20 .mu.m were observed. This is 20 to 40 times larger than crystal sizes observed when GaN films were grown under similar circumstances but without bismuth. It is thought that the observed increase in crystal size is due bismuth inducing an increased surface diffusion coefficient for gallium. The calculated value of 4.7.times.10.sup.-7 cm.sup.2 /sec. reveals a virtual substrate temperature of 1258 K which is 260 degrees higher than the actual one.

  12. Effect of thermal annealing on ZnO:Al thin films grown by spray pyrolysis

    NASA Astrophysics Data System (ADS)

    El Manouni, A.; Manjón, F. J.; Perales, M.; Mollar, M.; Marí, B.; Lopez, M. C.; Ramos Barrado, J. R.

    2007-07-01

    We report the effect of thermal annealing in air on the structural and optical properties of undoped and aluminium-doped (1%-4%) zinc oxide (AZO) thin films, grown by the spray pyrolysis technique on quartz substrates. Films were characterized by X-ray diffraction, low-temperature photoluminescence, electrical resistivity, and Raman spectroscopy after annealing at temperatures between 500 and 900 ∘C. Annealing in air improves the long-range order crystalline quality of the bulk crystals, but promotes a number of point defects in the surface affecting both the resistivity and the photoluminescence.

  13. One-dimensional edge state of Bi thin film grown on Si(111)

    SciTech Connect

    Kawakami, Naoya; Lin, Chun-Liang; Kawai, Maki; Takagi, Noriaki; Arafune, Ryuichi

    2015-07-20

    The geometric and electronic structures of the Bi thin film grown on Si(111) were investigated by using scanning tunneling microscopy and spectroscopy. We have found two types of edges, one of which hosts an electronic state localized one-dimensionally. We also revealed the energy dispersion of the localized edge state from the evolution of quasiparticle interference patterns as a function of energy. These spectroscopic findings well reproduce those acquired for the cleaved surface of the bulk Bi crystal [I. K. Drozdov et al., Nat. Phys. 10, 664 (2014)]. The present results indicate that the deposited Bi film provides a tractable stage for further scrutiny of the one-dimensional edge state.

  14. Roughness of CdTe thin films grown on glass by hot wall epitaxy

    NASA Astrophysics Data System (ADS)

    Leal, F. F.; Ferreira, S. O.; Menezes-Sobrinho, I. L.; Faria, T. E.

    2005-01-01

    Cadmium telluride films were grown on glass substrates using the hot wall epitaxy (HWE) technique. The samples were polycrystalline with a preferential (111) orientation. Scanning electron micrographs reveal a grain size between 0.1 and 0.5 µm. The surface morphology of the samples was studied by measuring the roughness profile using a stylus profiler. The roughness as a function of growth time and scale size were investigated to determine the growth and roughness exponents, β and α, respectively. From the results we can conclude that the growth surface has a self-affine character with a roughness exponent α equal to 0.69 ± 0.03 and almost independent of growth time. The growth exponent β was equal to 0.38 ± 0.06. These values agree with that determined previously for CdTe(111) films grown on GaAs(100).

  15. Growth and characterization of polymer thin films grown using molecular layer deposition with heterobifunctional precursors

    NASA Astrophysics Data System (ADS)

    Gibbs, Zachary Michael Conway

    In this work, growth of thin polymer films using molecular layer deposition with heterobifunctional precursors is investigated. Several growth phenomena are observed including: loss or gain of reactive sites as a result of precursor reactivity or vapor pressure; precursor diffusion and reaction within the porous polymer film; and crosslinking. Reactions were investigated using quartz crystal microbalance, Fourier transform infrared spectroscopy, and various ex situ techniques. Reactions involving 4-azidophenylisothiocyanate and 4-aminobenzonitrile were shown to stop growth after only a few cycles which is attributed to a loss in reactive sites which was modeled by an exponentially decaying growth rate. Growth of 4-carboxyphenylisothiocyanate with TMA and water was investigated as well. Active site multiplication as a result of the trifunctionality of the TMA molecule was proposed to explain the significantly higher growth rate for TMA/CI films. TMA/H2O/CI films showed the ability to crosslink through aluminum hydroxyl condensation reactions. Upon increasing the reaction temperature, reactant diffusion was observed in the form of mass removal upon TMA exposure. This same phenomena is thought to be occurring in films grown using Diels-Alder reactions in the third section of this thesis. These films showed a strong growth rate dependence upon reactant purge time and growth temperature. FTIR seems to weakly support Diels-Alder reaction, but it appears that the primary film growth mechanism is through CVD-like diffusion and condensation reactions.

  16. Photoinduced Br Desorption from CsBr Thin Films Grown on Cu(100)

    SciTech Connect

    Halliday, Matthew T.; Joly, Alan G.; Hess, Wayne P.; Shluger, AL

    2015-10-22

    Thin films of CsBr deposited onto metals such as copper are potential photocathode materials for light sources and other applications. We investigate desorption dynamics of Br atoms from CsBr films grown on insulator (KBr, LiF) and metal (Cu) substrates induced by sub-bandgap 6.4 eV laser pulses. The experimental results demonstrate that the peak kinetic energy of Br atoms desorbed from CsBr/Cu films is much lower than that for the hyperthermal desorption from CsBr/LiF films. Kelvin probe measurements indicate negative charge at the surface following Br desorption from CsBr/Cu films. Our ab initio calculations of excitons at CsBr surfaces demonstrate that this behavior can be explained by an exciton model of desorption including electron trapping at the CsBr surface. Trapped negative charges reduce the energy of surface excitons available for Br desorption. We examine the electron-trapping characteristics of low-coordinated sites at the surface, in particular, divacancies and kink sites. We also provide a model of cation desorption caused by Franck-Hertz excitation of F centers at the surface in the course of irradiation of CsBr/Cu films. These results provide new insights into the mechanisms of photoinduced structural evolution of alkali halide films on metal substrates and activation of metal photocathodes coated with CsBr.

  17. Triboelectric charge generation by semiconducting SnO2 film grown by atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Lee, No Ho; Yoon, Seong Yu; Kim, Dong Ha; Kim, Seong Keun; Choi, Byung Joon

    2017-07-01

    Improving the energy harvesting efficiency of triboelectric generators (TEGs) requires exploring new types of materials that can be used, and understanding their properties. In this study, we have investigated semiconducting SnO2 thin films as friction layers in TEGs, which has not been explored thus far. Thin films of SnO2 with various thicknesses were grown by atomic layer deposition on Si substrates. Either polymer or glass was used as counter friction layers. Vertical contact/separation mode was utilized to evaluate the TEG efficiency. The results indicate that an increase in the SnO2 film thickness from 5 to 25 nm enhances the triboelectric output voltage of the TEG. Insertion of a 400-nm-thick Pt sub-layer between the SnO2 film and Si substrate further increased the output voltage up to 120 V in a 2 cm × 2 cm contact area, while the enhancement was cancelled out by inserting a 10-nm-thick insulating Al2O3 film between SnO2 and Pt films. These results indicate that n-type semiconducting SnO2 films can provide triboelectric charge to counter-friction layers in TEGs.[Figure not available: see fulltext.

  18. Structural and electrical properties of large area epitaxial VO2 films grown by electron beam evaporation

    NASA Astrophysics Data System (ADS)

    Théry, V.; Boulle, A.; Crunteanu, A.; Orlianges, J. C.; Beaumont, A.; Mayet, R.; Mennai, A.; Cosset, F.; Bessaudou, A.; Fabert, M.

    2017-02-01

    Large area (up to 4 squared inches) epitaxial VO2 films, with a uniform thickness and exhibiting an abrupt metal-insulator transition with a resistivity ratio as high as 2.85 × 10 4 , have been grown on (001)-oriented sapphire substrates by electron beam evaporation. The lattice distortions (mosaicity) and the level of strain in the films have been assessed by X-ray diffraction. It is demonstrated that the films grow in a domain-matching mode where the distortions are confined close to the interface which allows growth of high-quality materials despite the high film-substrate lattice mismatch. It is further shown that a post-deposition high-temperature oxygen annealing step is crucial to ensure the correct film stoichiometry and provide the best structural and electrical properties. Alternatively, it is possible to obtain high quality films with a RF discharge during deposition, which hence do not require the additional annealing step. Such films exhibit similar electrical properties and only slightly degraded structural properties.

  19. Magnetic properties of Ni films deposited on MBE grown Bi2Se3 layers

    NASA Astrophysics Data System (ADS)

    Yoo, Taehee; Nasir, Alviu Rey; Bac, Seul-Ki; Lee, Sangyeop; Choi, Seonghoon; Lee, Sanghoon; Liu, X.; Furdyna, J. K.

    2017-05-01

    We have investigated the magnetic properties of the Ni films deposited on a GaAs and a Bi2Se3 buffer grown by molecular beam epitaxy on a GaAs (001) substrate. The magnetization measurements at 4 K revealed that the coercivity of the Ni films decreases monotonically with increasing thickness up to 25 nm in both cases. However, the coercivity measured at 4 K was always larger in the Ni film deposited on the surface of Bi2Se3 than in the film deposited on the GaAs. Such enhancement of the coercivity decreases with increasing temperature and film thickness. This suggests that the Bi2Se3 surface alters the magnetic properties of the Ni film. The increase of the coercivity was more serious in an un-capped Ni/Bi2Se3 sample, which showed an exchange bias effect due to the oxidation of the top surface of the Ni film. These observations are important for the investigation of spin dependent phenomena in magnetic systems involving a ferromagnet/topological insulator interface.

  20. Nanoindentation of YSZ-alumina ceramic thin films grown by combustion chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Stollberg, David Walter

    2000-10-01

    Yttria-stabilized zirconia (YSZ), alumina (Al2O 3), and YSZ-Al2O3 composites were deposited onto single crystal a-plane alumina using combustion chemical vapor deposition (CVD). Using an organic liquid as the flammable solvent and Y 2-ethylhexanoate, Zr 2-ethylhexanoate and Al acetylacetonate as the metal precursors in a 0.002 M concentration, films were grown with deposition rates of ˜1.5 mum/hr. The mechanical properties (hardness, elastic modulus and fracture toughness) of the films were measured using nanoindentation. Additions of second phase particles of Al2O3 to YSZ films increased the fracture toughness. Similarly, additions of second phase particles of YSZ to Al 2O3 films also increased the fracture toughness. Modeling of the fracture toughness of the YSZ-Al2O3 films was successfully achieved using the following toughening mechanisms: crack deflection from the second phase particles, grain bridging around the particles and residual stress from the CTE mismatch between the film and the substrate and between the second phase particles and the matrix of the film.

  1. Dysprosium oxide and dysprosium-oxide-doped titanium oxide thin films grown by atomic layer deposition

    SciTech Connect

    Tamm, Aile Kozlova, Jekaterina; Aarik, Lauri; Aarik, Jaan; Kukli, Kaupo; Link, Joosep; Stern, Raivo

    2015-01-15

    Dysprosium oxide and dysprosium-oxide-doped titanium oxide thin films were grown by atomic layer deposition on silicon substrates. For depositing dysprosium and titanium oxides Dy(thd){sub 3}-O{sub 3} and TiCl{sub 4}-O{sub 3} were used as precursors combinations. Appropriate parameters for Dy(thd){sub 3}-O{sub 3} growth process were obtained by using a quartz crystal microbalance system. The Dy{sub 2}O{sub 3} films were deposited on planar substrates and on three-dimensional substrates with aspect ratio 1:20. The Dy/Ti ratio of Dy{sub 2}O{sub 3}-doped TiO{sub 2} films deposited on a planar silicon substrate ranged from 0.04 to 0.06. Magnetometry studies revealed that saturation of magnetization could not be observed in planar Dy{sub 2}O{sub 3} films, but it was observable in Dy{sub 2}O{sub 3} films on 3D substrates and in doped TiO{sub 2} films with a Dy/Ti atomic ratio of 0.06. The latter films exhibited saturation magnetization 10{sup −6} A cm{sup 2} and coercivity 11 kA/m at room temperature.

  2. Biocompatibility of GaSb thin films grown by RF magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Nishimoto, Naoki; Fujihara, Junko; Yoshino, Katsumi

    2017-07-01

    GaSb may be suitable for biological applications, such as cellular sensors and bio-medical instrumentation because of its low toxicity compared with As (III) compounds and its band gap energy. Therefore, the biocompatibility and the film properties under physiological conditions were investigated for GaSb thin films with or without a surface coating. GaSb thin films were grown on quartz substrates by RF magnetron sputtering, and then coated with (3-mercaptopropyl) trimethoxysilane (MPT). The electrical properties, surface morphology, and crystal structure of the GaSb thin film were unaffected by the MPT coating. The cell viability assay suggested that MPT-coated GaSb thin films are biocompatible. Bare GaSb was particularly unstable in pH9 buffer. Ga elution was prevented by the MPT coating, although the Ga concentration in the pH 9 buffer was higher than that in the other solutions. The surface morphology and crystal structure were not changed by exposure to the solutions, except for the pH 9 buffer, and the thin film properties of MPT-coated GaSb exposed to distilled water and H2O2 in saline were maintained. These results indicate that MPT-coated GaSb thin films are biocompatible and could be used for temporary biomedical devices.

  3. Structural and chemical characterization of terbia thin films grown on hexagonally close packed metal substrates

    NASA Astrophysics Data System (ADS)

    Cartas, William

    Rare earth oxides (REOs) exhibit favorable catalytic performance for a diverse set of chemical transformations, including both partial and complete oxidation reactions. I will discuss our efforts to develop thin film systems of terbia for model surface science investigations of a REO that is effectively reducible, and which is thus expected to promote complete oxidation chemistry of adsorbed species. The growth of terbia on Cu(111) is shown to produce a complex surface that exhibits multiple phases of the oxide as well as exposed substrate. Growing the film on Pt(111) results in more uniform, single phase, and closed film. We used low energy electron diffraction (LEED) and scanning tunneling microscopy (STM) to characterize the structural properties of terbia thin films grown on Pt(111) in ultrahigh vacuum (UHV) using physical vapor deposition. We find that the REO grows as a high quality Tb2O 3(111) film, and adopts oxygen-deficient fluorite structures wherein the metal cations form a hexagonal lattice in registry with the Pt(111) substrate, while oxygen vacancies are randomly distributed within the film. The Tb 2O3(111) films are thermally stable when heated to 1000 K in UHV. LEED and STM show that a fraction of the Tb2O3 forms hexagonal islands when first deposited, and further depositions typically result in three dimensional growth of the film. The Tb2O3 (111) / Pt(111) system produces a coincidence structure, seen very clearly in LEED images. We have also found that Tb2O3(111) films can be oxidized in UHV by exposure to plasma-generated atomic oxygen beams. The oxidized films have an estimated TbO2 stoichiometry and decompose to Tb2O3 during heating, with O2 desorption starting at about 500 K. Terbia films oxidized at 90 K show a weakly bound state of oxygen that is likely chemisorbed. Temperature programmed reaction spectroscopy (TPRS) studies using methanol show that increased oxygen in the film does not modify the chemical selectivity of the film; however

  4. Elastic properties of B-C-N films grown by N{sub 2}-reactive sputtering from boron carbide targets

    SciTech Connect

    Salas, E.; Jiménez Riobóo, R. J.; Jiménez-Villacorta, F.; Prieto, C.; Sánchez-Marcos, J.; Muñoz-Martín, A.; Prieto, J. E.; Joco, V.

    2013-12-07

    Boron-carbon-nitrogen films were grown by RF reactive sputtering from a B{sub 4}C target and N{sub 2} as reactive gas. The films present phase segregation and are mechanically softer than boron carbide films (a factor of more than 2 in Young's modulus). This fact can turn out as an advantage in order to select buffer layers to better anchor boron carbide films on substrates eliminating thermally induced mechanical tensions.

  5. Perpendicular magnetic anisotropy in epitaxially strained cobalt-ferrite (001) thin films

    SciTech Connect

    Yanagihara, H. Utsumi, Y.; Niizeki, T. Inoue, J.; Kita, Eiji

    2014-05-07

    We investigated the dependencies of both the magnetization characteristics and the perpendicular magnetic anisotropy of Co{sub x}Fe{sub 3–x}O{sub 4}(001) epitaxial films (x = 0.5 and 0.75) on the growth conditions of the reactive magnetron sputtering process. Both saturation magnetization and the magnetic uniaxial anisotropy constant K{sub u} are strongly dependent on the reactive gas (O{sub 2}) flow rate, although there is little difference in the surface structures for all samples observed by reflection high-energy electron diffraction. In addition, certain dead-layer-like regions were observed in the initial stage of the film growth for all films. Our results suggest that the magnetic properties of Co{sub x}Fe{sub 3–x}O{sub 4} epitaxial films are governed by the oxidation state and the film structure at the vicinity of the interface.

  6. Influence of solution viscosity on hydrothermally grown ZnO thin films for DSSC applications

    NASA Astrophysics Data System (ADS)

    Marimuthu, T.; Anandhan, N.; Thangamuthu, R.; Surya, S.

    2016-10-01

    Zinc oxide (ZnO) nanowire arrays (NWAs) were grown onto zinc oxide-titanium dioxide (ZnO-TiO2) seeded fluorine doped tin oxide (FTO) conductive substrate by hydrothermal technique. X-ray diffraction (XRD) patterns depict that ZnO thin films are preferentially oriented along the (002) plane with hexagonal wurtzite structure. Viscosity measurements reveal that viscosity of the solutions linearly increases as the concentrations of the polyvinyl alcohol (PVA) increase in the growth solution. Field emission scanning electron microscope (FE-SEM) images show that the NWAs are vertically grown to seeded FTO substrate with hexagonal structure, and the growth of NWAs decreases as the concentration of the PVA increases. Stylus profilometer and atomic force microscopic (AFM) studies predict that the thickness and roughness of the films decrease with increasing the PVA concentrations. The NWAs prepared at 0.1% of PVA exhibits a lower transmittance and higher absorbance than that of the other films. The band gap of the optimized films prepared at 0.0 and 0.1% of PVA is found to be 3.270 and 3.268 eV, respectively. The photo to current conversion efficiency of the DSSC based on photoanodes prepared at 0.0 and 0.1% of PVA exhibits about 0.64 and 0.82%, respectively. Electrochemical impedance spectra reveal that the DSSC based on photoanode prepared at 0.1% of PVA has the highest charge transfer recombination resistance.

  7. Aqueous Solution Preparation, Structure, and Magnetic Properties of Nano-Granular ZnxFe3−xO4 Ferrite Films

    PubMed Central

    2010-01-01

    This paper reports a simple and novel process for preparing nano-granular ZnxFe3−xO4 ferrite films (0 ≤ x ≤ 0.99) on Ag-coated glass substrates in DMAB-Fe(NO3)3-Zn(NO3)2 solutions. The deposition process may be applied in preparing other cations-doped spinel ferrite films. The Zn content x in the ZnxFe3−xO4 films depends linearly on the Zn2+ ion concentration ranging from 0.0 to 1.0 mM in the aqueous solutions. With x increasing from 0 to 0.99, the lattice constant increases from 0.8399 to 0.8464 nm; and the microstructure of the films changes from the non-uniform nano-granules to the fine and uniform nano-granules of 50–60 nm in size. The saturation magnetization of the films first increases from 75 emu/g to the maximum 108 emu/g with x increasing from 0 to 0.33 and then decreases monotonously to 5 emu/g with x increasing from 0.33 to 0.99. Meanwhile, the coercive force decreases monotonously from 116 to 13 Oe. PMID:20730079

  8. Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

    NASA Astrophysics Data System (ADS)

    Miikkulainen, Ville; Leskelä, Markku; Ritala, Mikko; Puurunen, Riikka L.

    2013-01-01

    Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely suitable for depositing uniform and conformal films on complex three-dimensional topographies. The deposition of a film of a given material by ALD relies on the successive, separated, and self-terminating gas-solid reactions of typically two gaseous reactants. Hundreds of ALD chemistries have been found for depositing a variety of materials during the past decades, mostly for inorganic materials but lately also for organic and inorganic-organic hybrid compounds. One factor that often dictates the properties of ALD films in actual applications is the crystallinity of the grown film: Is the material amorphous or, if it is crystalline, which phase(s) is (are) present. In this thematic review, we first describe the basics of ALD, summarize the two-reactant ALD processes to grow inorganic materials developed to-date, updating the information of an earlier review on ALD [R. L. Puurunen, J. Appl. Phys. 97, 121301 (2005)], and give an overview of the status of processing ternary compounds by ALD. We then proceed to analyze the published experimental data for information on the crystallinity and phase of inorganic materials deposited by ALD from different reactants at different temperatures. The data are collected for films in their as-deposited state and tabulated for easy reference. Case studies are presented to illustrate the effect of different process parameters on crystallinity for representative materials: aluminium oxide, zirconium oxide, zinc oxide, titanium nitride, zinc zulfide, and ruthenium. Finally, we discuss the general trends in the development of film crystallinity as function of ALD process parameters. The authors hope that this review will help newcomers to ALD to familiarize themselves with the complex world of crystalline ALD films and, at the same time, serve for the expert as a handbook-type reference source on ALD processes and film crystallinity.

  9. RAPID COMMUNICATION: ? thin film bilayers grown by pulsed laser ablation deposition

    NASA Astrophysics Data System (ADS)

    Singh, S. K.; Palmer, S. B.; McK Paul, D.; Lees, M. R.

    1996-09-01

    We have grown superconducting thin films of 0022-3727/29/9/044/img2 (Y-123) on 0022-3727/29/9/044/img3 (PCMO) buffer layers and PCMO overlayers on Y-123 thin films using pulsed laser ablation deposition. For both sets of films below 50 K, the Y-123 layer is superconducting and the zero-field cooled PCMO layer is insulating. The application of a magnetic field of 8 T results in an insulator - metal transition in the PCMO layer. This field-induced conducting state is stable in zero magnetic field at low temperature. The PCMO layer can be returned to an insulating state by annealing above 100 K. This opens the way for the construction of devices incorporating these oxide materials in which the electronic properties of key components such as the substrate or the barrier layer can be switched in a controlled way by the application of a magnetic field.

  10. Semiconductor-metal transition in thin VO2 films grown by ozone based atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Rampelberg, Geert; Schaekers, Marc; Martens, Koen; Xie, Qi; Deduytsche, Davy; De Schutter, Bob; Blasco, Nicolas; Kittl, Jorge; Detavernier, Christophe

    2011-04-01

    Thin films of vanadium dioxide (VO2) have been grown by a low temperature atomic layer deposition process at 150 °C using tetrakis[ethylmethylamino]vanadium as a vanadium source and ozone as reactant gas. Films deposited on SiO2 were amorphous, but during a thermal treatment at 450 °C tetragonal VO2(R) was formed. During in situ x-ray diffraction measurements, the semiconductor-metal transition was observed as a reversible transition between VO2(M1) and VO2(R) near 67 °C. Correlated with this phase change, a reversible change in resistivity was observed of more than two orders of magnitude for a film of 42 nm thickness.

  11. Arsenic doped p-type zinc oxide films grown by radio frequency magnetron sputtering

    SciTech Connect

    Fan, J. C.; Zhu, C. Y.; Fung, S.; To, C. K.; Yang, B.; Beling, C. D.; Ling, C. C.; Zhong, Y. C.; Wong, K. S.; Xie, Z.; Brauer, G.; Skorupa, W.; Anwand, W.

    2009-10-01

    As-doped ZnO films were grown by the radio frequency magnetron sputtering method. As the substrate temperature during growth was raised above approx400 deg. C, the films changed from n type to p type. Hole concentration and mobility of approx6x10{sup 17} cm{sup -3} and approx6 cm{sup 2} V{sup -1} s{sup -1} were achieved. The ZnO films were studied by secondary ion mass spectroscopy, x-ray photoelectron spectroscopy (XPS), low temperature photoluminescence (PL), and positron annihilation spectroscopy (PAS). The results were consistent with the As{sub Zn}-2V{sub Zn} shallow acceptor model proposed by Limpijumnong et al. [Phys. Rev. Lett. 92, 155504 (2004)]. The results of the XPS, PL, PAS, and thermal studies lead us to suggest a comprehensive picture of the As-related shallow acceptor formation.

  12. Thin film phase diagram of iron nitrides grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Gölden, D.; Hildebrandt, E.; Alff, L.

    2017-01-01

    A low-temperature thin film phase diagram of the iron nitride system is established for the case of thin films grown by molecular beam epitaxy and nitrided by a nitrogen radical source. A fine-tuning of the nitridation conditions allows for growth of α ‧ -Fe8Nx with increasing c / a -ratio and magnetic anisotropy with increasing x until almost phase pure α ‧ -Fe8N1 thin films are obtained. A further increase of nitrogen content below the phase decomposition temperature of α ‧ -Fe8N (180 °C) leads to a mixture of several phases that is also affected by the choice of substrate material and symmetry. At higher temperatures (350 °C), phase pure γ ‧ -Fe4N is the most stable phase.

  13. Chemical and Magnetic Properties of NiO Thin Films Epitaxially Grown on Fe(001)

    NASA Astrophysics Data System (ADS)

    Brambilla, Alberto

    2008-01-01

    Very high quality NiO films have been grown on Fe(001) by means of Molecular Beam Epitaxy. The chemical and magnetic properties of the NiO/Fe(001) interface have been evaluated by means of X-ray Absorption Spectroscopy and X-ray Magnetic Circular Dichroism. Furthermore, combined use of X-ray Magnetic Linear Dichroism and PhotoElectron Emission Microscopy allowed to observe an in-plane uniaxial magnetic anisotropy in very thin NiO films. For NiO films thinner than about 9 atomic layers the NiO magnetic moments align in-plane perpendicular to the Fe substrate magnetization. Above such critical thickness the coupling turns out to be collinear. The effects of thermal treatments, fundamental to produce exchange-biased structures, have also been considered.

  14. Structural and optical properties of PbS thin films grown by chemical bath deposition

    SciTech Connect

    Seghaier, S.; Kamoun, N.; Guasch, C.; Zellama, K.

    2007-09-19

    Lead sulphide thin films are grown on glass substrates at various deposition times tD, in the range of 40-60 min per step of 2 min, using the chemical bath deposition technique. X-ray diffraction and atomic force microscopy are used to characterize the film structure. The surface composition is analysed by Auger electron spectroscopy. It appears that the as-prepared thin films are polycrystalline with cubic structure. Nanometric scale crystallites are uniformly distributed on the surface. They exhibit almost a stoechiometric composition with a [Pb]/[S] ratio equal to 1.10. Optical properties are studied in the range of 300-3300 nm by spectrophotometric measurements. Analysis of the optical absorption data of lead sulphide thin layers reveals a narrow optical direct band gap equal to 0.46 eV for the layer corresponding to a deposition time equal to 60 min.

  15. Strain-induced spin reorientation of bcc-like iron films grown on Cu(001)

    NASA Astrophysics Data System (ADS)

    Corredor, Edna C.; Arnaudas, José I.; Ciria, Miguel; Lofink, Fabian; Rößler, Stefan; Frömter, Robert; Oepen, Hans Peter

    2014-11-01

    The in-plane orientation of the magnetization vector M in bcc-like Fe(110) films grown on Cu(001) is determined by means of scanning electron microscopy with polarization analysis. For thicknesses of 2 nm, slightly above the fcc/bcc phase transition, it is found that M is oriented along the ⟨110⟩ directions of the Cu(001) substrate. Following the Pitsch orientational relationship these correspond to magnetically hard ⟨ 1 1 ¯1 ⟩ and ⟨ 1 1 ¯2 ⟩ axes of bulk iron. This finding is in strong contrast to the behavior reported for thicker films (above 3 nm) of bcc Fe/Cu(001), where the ⟨100⟩ directions of the substrate are preferred. The role of strain in the iron film is discussed, inferring that the presence of a shear strain is mandatory to explain the spin reorientation via the magnetoelastic contribution to the magnetic anisotropy energy.

  16. Labyrinthine and dendritic patterns in polyethylene oxide films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Karoutsos, V.; Gontad, F.; Kantarelis, S.; Lorusso, A.; Perrone, A.; Vainos, N. A.

    2017-04-01

    Polyethylene oxide (PEO) films were grown by pulsed laser deposition using two different lasers: ArF (193 nm, 5 ns) and Nd:YAG (355 nm, 7 ns). Even though very similar experimental conditions have been applied to ablate identical targets, different surface morphologies and structures have been observed. Depending on laser fluence, labyrinthine patterns in PEO films have been formed when using 355 nm laser pulses at fluence values in the range 280-1000 mJ/cm2. The same material ablated by 193 nm excimer laser pulses at 200 mJ/cm2 fluence grows in dendritic morphologies. Both target and laser deposited materials have been thoroughly characterized using infrared spectroscopic, microscopic and X-ray analytical methods. Infrared spectroscopy demonstrated the close similarity of molecular chains for both target and film materials. X-ray diffraction analysis indicates polymer chain scissoring by ultraviolet irradiation, a fact also confirmed by size exclusion chromatography.

  17. A study on the epitaxial Bi2Se3 thin film grown by vapor phase epitaxy

    NASA Astrophysics Data System (ADS)

    Lin, Yen-Cheng; Chen, Yu-Sung; Lee, Chao-Chun; Wu, Jen-Kai; Lee, Hsin-Yen; Liang, Chi-Te; Chang, Yuan Huei

    2016-06-01

    We report the growth of high quality Bi2Se3 thin films on Al2O3 substrates by using chemical vapor deposition. From the atomic force microscope, x-ray diffraction and transmission electron microscope measurements we found that the films are of good crystalline quality, have two distinct domains and can be grown epitaxially on the Al2O3 substrate. Carrier concentration in the sample is found to be 1.1 × 1019 cm-3 between T = 2 K to T = 300 K, and electron mobility can reach 954 cm2/V s at T = 2 K. Weak anti-localization effect is observed in the low temperature magneto-transport measurement for the sample which indicates that the thin film has topological surface state.

  18. Arsenic doped p-type zinc oxide films grown by radio frequency magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Fan, J. C.; Zhu, C. Y.; Fung, S.; Zhong, Y. C.; Wong, K. S.; Xie, Z.; Brauer, G.; Anwand, W.; Skorupa, W.; To, C. K.; Yang, B.; Beling, C. D.; Ling, C. C.

    2009-10-01

    As-doped ZnO films were grown by the radio frequency magnetron sputtering method. As the substrate temperature during growth was raised above ˜400 °C, the films changed from n type to p type. Hole concentration and mobility of ˜6×1017 cm-3 and ˜6 cm2 V-1 s-1 were achieved. The ZnO films were studied by secondary ion mass spectroscopy, x-ray photoelectron spectroscopy (XPS), low temperature photoluminescence (PL), and positron annihilation spectroscopy (PAS). The results were consistent with the AsZn-2VZn shallow acceptor model proposed by Limpijumnong et al. [Phys. Rev. Lett. 92, 155504 (2004)]. The results of the XPS, PL, PAS, and thermal studies lead us to suggest a comprehensive picture of the As-related shallow acceptor formation.

  19. Lithium outdiffusion in LiTi2O4 thin films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Mesoraca, S.; Kleibeuker, J. E.; Prasad, B.; MacManus-Driscoll, J. L.; Blamire, M. G.

    2016-11-01

    We report surface chemical cation composition analysis of high quality superconducting LiTi2O4 thin films, grown epitaxially on MgAl2O4 (111) substrates by pulsed laser deposition. The superconducting transition temperature of the films was 13.8 K. Surface chemical composition is crucial for the formation of a good metal/insulator interface for integrating LiTi2O4 into full-oxide spin-filtering devices in order to minimize the formation of structural defects and increase the spin polarisation efficiency. In consideration of this, we report a detailed angle resolved x-ray photoelectron spectroscopy analysis. Results show Li segregation at the surface of LiTi2O4 films. We attribute this process due to outdiffusion of Li toward the outermost LiTi2O4 layers.

  20. Properties of boron-doped ZnO thin films grown by using MOCVD

    NASA Astrophysics Data System (ADS)

    Choi, In-Hwan

    2013-11-01

    Boron-doped ZnO thin films were prepared by using metal organic chemical-vapor deposition (MOCVD) with diethyl zinc and water as precursors and B2H6 as the dopant gas. The effects of the flow rates of H2O and B2H6 on the growth and the electrical properties of boron-doped ZnO thin film were investigated. The maximum carrier concentration and mobility and the minimum resistivity obtained under these experimental conditions were 7 × 1020 /cm3, 42 cm2 /V·sec and 4 × 10-4 Ω·cm, respectively, at room temperature. The electrical properties, growth rates, transmittances, and surface morphologies of the ZnO:B films grown using MOCVD are strongly affected by growth conditions such as the relative flow rates of the precursors and dopant gases and the chamber pressure, and these effects are discussed in detail in this article.

  1. Photoluminescence properties of MgxZn1-xO films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Wu, T. Y.; Huang, Y. S.; Hu, S. Y.; Lee, Y. C.; Tiong, K. K.; Chang, C. C.; Chou, W. C.; Shen, J. L.

    2017-02-01

    The optical properties of MgxZn1-xO films with x=0.03, 0.06, 0.08, and 0.11 grown by molecular beam epitaxy (MBE) have been studied by temperature-dependent photoluminescence (PL) measurement. It is presented that the full-width at half-maximum (FWHM) of the 12 K PL spectrum of MgZnO films increases with increasing Mg concentration and would deviate significantly from the simulation curve of Schubert model with higher Mg contents. The abnormal broader PL FWHM is inferred from larger compositional fluctuation by incorporating higher Mg contents, which results in larger effect of excitonic localization to induce more significant S-shaped behavior of the PL peak energy with temperature dependence. Additionally, the degree of localization increases as the linear proportion of the PL FWHM, indicating that the excitonic behavior in MgZnO films belong to the strong localization effect.

  2. Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs

    NASA Astrophysics Data System (ADS)

    Zhou, Yan; Ramaneti, Rajesh; Anaya, Julian; Korneychuk, Svetlana; Derluyn, Joff; Sun, Huarui; Pomeroy, James; Verbeeck, Johan; Haenen, Ken; Kuball, Martin

    2017-07-01

    Polycrystalline diamond (PCD) was grown onto high-k dielectric passivated AlGaN/GaN-on-Si high electron mobility transistor (HEMT) structures, with film thicknesses ranging from 155 to 1000 nm. Transient thermoreflectance results were combined with device thermal simulations to investigate the heat spreading benefit of the diamond layer. The observed thermal conductivity (κDia) of PCD films is one-to-two orders of magnitude lower than that of bulk PCD and exhibits a strong layer thickness dependence, which is attributed to the grain size evolution. The films exhibit a weak temperature dependence of κDia in the measured 25-225 °C range. Device simulation using the experimental κDia and thermal boundary resistance values predicts at best a 15% reduction in peak temperature when the source-drain opening of a passivated AlGaN/GaN-on-Si HEMT is overgrown with PCD.

  3. Field emission properties of carbon nanotubes film grown on NiCr alloy films

    NASA Astrophysics Data System (ADS)

    Chen, T.; Wang, L. L.; Chen, Y. W.; Que, W. X.; Sun, Z.

    2007-06-01

    Carbon nanotubes (CNTs) are prepared on NiCr alloy films by low pressure thermal chemical vapor deposition at 600 °C. NiCr alloy films are deposited by magnetic co-sputtering method, and the various thickness and Ni/NiCr ratios are controlled by sputtering power. The diameter and length of CNTs, as well as the roughness of the CNTs films, mainly depend on the Ni/NiCr ratio. The field emission current density of the CNTs film increases with the increasing Ni/NiCr ratio from 65 wt% to 83 wt%, and decreases when the Ni/NiCr ratio is more than 87 wt% in the alloy film.

  4. Low-temperature transport properties of multigraphene films grown on the SiC surface by sublimation

    SciTech Connect

    Lebedev, A. A. Agrinskaya, N. V.; Lebedev, S. P.; Mynbaeva, M. G.; Petrov, V. N.; Smirnov, A. N.; Strel'chuk, A. M.; Titkov, A. N.; Shamshur, D. V.

    2011-05-15

    Multigraphene films grown by sublimation on the surface of a semi-insulating 6H-SiC substrate have been studied. It is shown that pregrowth annealing of the substrate in a quasiclosed growth cell improves the structural quality of a multigraphene film. Ohmic contacts to the film have been fabricated, and the Hall effect has been studied at low temperatures. It is found that a 2D electron gas exists in the films. It is concluded that the conductivity of the film is determined by defects existing within the graphene layer or at the interface between the graphene film and a SiC substrate.

  5. Preparation and characterization of epitaxially grown unsupported yttria-stabilized zirconia (YSZ) thin films

    NASA Astrophysics Data System (ADS)

    Götsch, Thomas; Mayr, Lukas; Stöger-Pollach, Michael; Klötzer, Bernhard; Penner, Simon

    2015-03-01

    Epitaxially grown, chemically homogeneous yttria-stabilized zirconia thin films ("YSZ", 8 mol% Y2O3) are prepared by direct-current sputtering onto a single-crystalline NaCl(0 0 1) template at substrate temperatures ≥493 K, resulting in unsupported YSZ films after floating off NaCl in water. A combined methodological approach by dedicated (surface science) analytical characterization tools (transmission electron microscopy and diffraction, atomic force microscopy, angle-resolved X-ray photoelectron spectroscopy) reveals that the film grows mainly in a [0 0 1] zone axis and no Y-enrichment in surface or bulk regions takes place. In fact, the Y-content of the sputter target is preserved in the thin films. Analysis of the plasmon region in EEL spectra indicates a defective nature of the as-deposited films, which can be suppressed by post-deposition oxidation at 1073 K. This, however, induces considerable sintering, as deduced from surface morphology measurements by AFM. In due course, the so-prepared unsupported YSZ films might act as well-defined model systems also for technological applications.

  6. Magnetic phases of thin Fe films grown on stepped Cr(001)

    SciTech Connect

    Escorcia-Aparicio, E.J.; Wolfe, J.H.; Choi, H.J.; Ling, W.L.; Kawakami, R.K.; Qiu, Z.Q.

    1999-05-01

    Magnetic phases of Fe films grown on curved Cr(001) with steps parallel to [100] are studied using the surface magneto-optic Kerr effect (SMOKE). We found that the atomic steps (1) induce an in-plane uniaxial magnetic anisotropy with the easy magnetization axis parallel to the step edges, and (2) generate magnetic frustration either inside the Fe film or at the Fe-Cr interface, depending on the Fe film thickness and the vicinal angle. For thickness greater than 35 {Angstrom}, the Fe film forms a single magnetic domain and undergoes an in-plane magnetization switching due to the competition of the step-induced anisotropy and the Fe-Cr interfacial frustration. For thickness less than 35 {Angstrom}, the Fe film forms multiple magnetic domains at low vicinal angle, and transforms into a single domain at high vicinal angle. A magnetic phase diagram in the 30{endash}45 {Angstrom} thickness range was obtained using a wedge-shaped Fe film. {copyright} {ital 1999} {ital The American Physical Society}

  7. On the microstructure of thin films grown by an isotropically directed deposition flux

    SciTech Connect

    Alvarez, R.; Romero-Gomez, P.; Gil-Rostra, J.; Yubero, F.; Palmero, A.; Gonzalez-Elipe, A. R.; Cotrino, J.

    2010-09-15

    The influence of isotropically directed deposition flux on the formation of the thin film microstructure at low temperatures is studied. For this purpose we have deposited TiO{sub 2} thin films by two different deposition techniques: reactive magnetron sputtering, in two different experimental configurations, and plasma enhanced chemical vapor deposition. The obtained results indicate that films grown under conditions where deposition particles do not possess a clear directionality, and in the absence of a relevant plasma/film interaction, present similar refractive indices no matter the deposition technique employed. The film morphology is also similar and consists of a granular surface topography and a columnarlike structure in the bulk whose diameter increases almost linearly with the film thickness. The deposition has been simulated by means of a Monte Carlo model, taking into account the main processes during growth. The agreement between simulations and experimental results indicates that the obtained microstructures are a consequence of the incorporation of low-energy, isotropically directed, deposition particles.

  8. Large-Area WS2 Film with Big Single Domains Grown by Chemical Vapor Deposition.

    PubMed

    Liu, Pengyu; Luo, Tao; Xing, Jie; Xu, Hong; Hao, Huiying; Liu, Hao; Dong, Jingjing

    2017-10-03

    High-quality WS2 film with the single domain size up to 400 μm was grown on Si/SiO2 wafer by atmospheric pressure chemical vapor deposition. The effects of some important fabrication parameters on the controlled growth of WS2 film have been investigated in detail, including the choice of precursors, tube pressure, growing temperature, holding time, the amount of sulfur powder, and gas flow rate. By optimizing the growth conditions at one atmospheric pressure, we obtained tungsten disulfide single domains with an average size over 100 μm. Raman spectra, atomic force microscopy, and transmission electron microscopy provided direct evidence that the WS2 film had an atomic layer thickness and a single-domain hexagonal structure with a high crystal quality. And the photoluminescence spectra indicated that the tungsten disulfide films showed an evident layer-number-dependent fluorescence efficiency, depending on their energy band structure. Our study provides an important experimental basis for large-area, controllable preparation of atom-thick tungsten disulfide thin film and can also expedite the development of scalable high-performance optoelectronic devices based on WS2 film.

  9. Structural properties of highly conductive ultra-nanocrystalline diamond films grown by hot-filament CVD

    NASA Astrophysics Data System (ADS)

    Mertens, M.; Lin, I.-N.; Manoharan, D.; Moeinian, A.; Brühne, K.; Fecht, H. J.

    2017-01-01

    In this work we show the correlation of the electrical conductivity of ultra-nanocrystalline (UNCD) diamond films grown by hot filament chemical vapor deposition (HFCVD) with their structural properties. The substrate temperature, the methane to hydrogen ratio and the pressure are the main factor influencing the growth of conductive UNCD films, which extends from electrical resistive diamond films (<10-4 S/cm) to highly conductive diamond films with a specific conductivity of 300 S/cm. High-resolution-transmission-electron-microscopy (HRTEM) and electron-energy-loss-spectroscopy (EELS) have been done on the highly conductive diamond films, to show the origin of the high electrical conductivity. The HRTEM results show random oriented diamond grains and a large amount of nano-graphite between the diamond crystals. EELS investigations are confirming these results. Raman measurements are correlated with the specific conductivity, which shows structural changes of sp2 carbons bonds as function of conductivity. Hall experiments complete the results, which lead to a model of an electron mobility based conductivity, which is influenced by the structural properties of the grain boundary regions in the ultra-nanocrystalline diamond films.

  10. Characterization of nanostructured iron selenide thin films grown by chemical route at room temperature

    SciTech Connect

    Ubale, A.U.; Sakhare, Y.S.; Belkedkar, M.R.; Singh, Arvind

    2013-02-15

    Highlights: ► Nanostructured FeSe thin films were successfully synthesized at room temperature by CBD method. ► The XRD and EDAX characterization confirms nanocrystalline nature of FeSe. ► The SEM and AFM show microporous morphology with nanorods and nanoplates of FeSe. -- Abstract: Iron selenide thin films have been deposited onto glass substrates by using chemical bath deposition technique. Structural characterization of iron selenide thin films was carried out by means of X-ray diffraction and Fourier transforms infrared spectrum. The morphological characterization of FeSe thin film was carried out using scanning electron microscopy and atomic force microscopy, which revealed porous grain morphology of FeSe with some nano rectangular rods and plates grown on it. The as-deposited thin films exhibited optical band gap energy 2.60 eV. The as deposited FeSe thin films are semiconducting in nature with p-type electrical conductivity. The room temperature electrical resistivity is of the order of 1.1 × 10{sup 5} Ω-cm with activation energy 0.26 and 0.95 eV, respectively, in low and high temperature region.

  11. Orientational control of CeO2 films on sapphire substrates grown by magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Yamamoto, S.; Sugimoto, M.; Koshikawa, H.; Hakoda, T.; Yamaki, T.

    2017-06-01

    The effect of deposition temperature and post-annealing on the crystallographic orientation of cerium dioxide (CeO2) films on sapphire (α-Al2O3) substrates were investigated. CeO2 films, with thickness of 17 nm, were grown on c-plane and r-plane sapphire substrates by radiofrequency (rf) magnetron sputtering. Deposition temperatures between 150 and 500 °C were used with a sintered CeO2 target in an Ar-O2 gas mixture. The post-annealing treatment was performed in air at various temperatures ranging from 400 to 1000 °C. The films were characterized by X-ray diffraction, atomic force microscopy, and Rutherford backscattering spectroscopy. X-ray diffraction studies revealed that the orientation of the CeO2 films changed from (001) to mixed (001)/(111) and then to (111), with increasing deposition temperatures on both the c-plane and r-plane sapphire substrates. Post-annealing at 1000 °C improved the degree of crystallinity of the films, and formed rectangular grains. The results suggest that control of the deposition and post-annealing temperatures provides orientation-controlled CeO2 films on c- and r-plane sapphire substrates.

  12. Magnetism of ultrathin Pd99Fe01 films grown on niobium

    NASA Astrophysics Data System (ADS)

    Uspenskaya, L. S.; Rakhmanov, A. L.; Dorosinskii, L. A.; Bozhko, S. I.; Stolyarov, V. S.; Bolginov, V. V.

    2014-09-01

    Magnetic properties of ultrathin Pd99Fe01 films grown on niobium films are investigated by magneto-optic visualization, SQUID magnetometry, and Hall-voltage measurements in the temperature range from 3 to 40 K. We show that the films are ferromagnetic at thickness larger than 10 nm. The Curie temperature {{T}_{C}} varies from 2 to 40 K with increase of film thickness to 80 nm. The value of spontaneous magnetization of the Pd99Fe01 depends on the PdFe film thickness. The estimated spin polarization is about 4 {{\\mu }_{B}} per Fe ion, which corresponds to the polarization of the Pd3Fe compound. In contrast to the homogenous bulk material, Pd99Fe01 films consist of ferromagnetic nano-clusters in a paramagnetic host, which is confirmed by characteristic features of the magnetization loops and by the increase of critical current density in the adjacent Nb layer. The size of the clusters is estimated as 10 nm, which is in agreement with the 30% increase of the supercurrent observed in the Nb.

  13. Characteristics of multivalent impurity doped C 60 films grown by MBE

    NASA Astrophysics Data System (ADS)

    Nishinaga, Jiro; Aihara, Tomoyuki; Kawaharazuka, Atsushi; Horikoshi, Yoshiji

    2007-04-01

    Metal-doped C 60 films (aluminum, gallium and germanium) are grown on GaAs and quartz glass substrates by solid source molecular beam epitaxy. Mechanical and optical properties of the films are investigated by Vickers hardness test and photoluminescence (PL) measurement. Vickers hardness values of all the impurity-doped C 60 films are considerably enhanced. PL peaks of the electron transition between the highest occupied molecular orbital and the lowest unoccupied molecular orbital states of C 60 molecules are confirmed in Al-doped and Ga-doped C 60 films, but not in Ge-doped C 60 films. Optimized bonding structures of these impurity atoms to C 60 molecules are determined by using ab initio calculations. Stable covalent bonds between impurities and C 60 molecules are verified to be formed. The impurity atoms may act as bridges between C 60 molecules. The distortion of C 60 cages due to the bonding with metals is confirmed. In the Al- and Ga-doped C 60 films, this distortion probably makes the dipole forbidden transition relieved. The binding energies are found to be related to the experimentally determined Vickers hardness.

  14. Topological limit of ultrathin quasi-freestanding Bi2Te3 films grown on Si(111)

    NASA Astrophysics Data System (ADS)

    Liu, Yang; Wang, Huan-Hua; Bian, Guang; Bissen, Mark; Zhang, Zhan; Miller, Tom; Hong, Hawoong; Chiang, Tai-Chang

    2013-03-01

    A fundamental issue for ultrathin topological films is the thickness limit below which the topological surface states become impacted by interfacial interactions. We show that for Bi2Te3 grown on Si(111) this limit is four quintuple layers (QLs) based on angle-resolved photoemission measurements, using optimized photon energies and polarizations, of the Dirac cone warping and interaction-induced gap as a function of film thickness. The results are close to theoretical predictions for free-standing films, despite the expected strong bonding of the film with the reactive Si(111) substrate. In-situ surface X-ray scattering (SXS) study shows that a buffer layer exist on the Si(111) surface, which effectively saturates all the Si(111) dangling bonds. These interfacial properties, revealed only by diffractions from deeply penetrating X-rays, are critical in understanding the topological surface states in ultrathin films, where electronic coupling is strongly enhanced. Our SXS measurement also yields new information regarding the internal structures of these topological thin films, including layer stacking, QL-by-QL growth, relaxations, etc.

  15. Ferrite plating in aqueous solution: New technique for preparing magnetic thin film

    NASA Astrophysics Data System (ADS)

    Abe, Masanori; Tamaura, Yutaka

    1984-03-01

    This paper describes the principle and performance of a new technique which facilitates the formation of crystalline spinel film at low temperature (T<80 °C) without a heat treatment. For a substrate, not only a metal but also oxides and organic compounds can be used. Various transition metals (M=Ni, Co, Mn, Cu, Zn, etc.) are incorporated into the spinel. Hydrolyzed metal ions FeOH+ and MOH(n-1)+ in an aqueous solution (pH=6˜11,T=40˜80 °C) are adsorbed on a substrate surface which react into spinel film associated with anodic or air oxidation of the FeOH+ ion. We have plated Fe3O4 and CoFe2O4 films on a substrate of Cu, polyethylene terephthalate, and stainless steel. They are polycrystalline with no preferred orientation, and exhibit no magnetic anisotropy. The polar Kerr rotation of these films has been measured.

  16. Nanoscale magnetization reversal caused by electric field-induced ion migration and redistribution in cobalt ferrite thin films.

    PubMed

    Chen, Xinxin; Zhu, Xiaojian; Xiao, Wen; Liu, Gang; Feng, Yuan Ping; Ding, Jun; Li, Run-Wei

    2015-04-28

    Reversible nanoscale magnetization reversal controlled merely by electric fields is still challenging at the moment. In this report, first-principles calculation indicates that electric field-induced magnetization reversal can be achieved by the appearance of unidirectional magnetic anisotropy along the (110) direction in Fe-deficient cobalt ferrite (CoFe(2-x)O4, CFO), as a result of the migration and local redistribution of the Co(2+) ions adjacent to the B-site Fe vacancies. In good agreement with the theoretical model, we experimentally observed that in the CFO thin films the nanoscale magnetization can be reversibly and nonvolatilely reversed at room temperature via an electrical ion-manipulation approach, wherein the application of electric fields with appropriate polarity and amplitude can modulate the size of magnetic domains with different magnetizations up to 70%. With the low power consumption (subpicojoule) characteristics and the elimination of external magnetic field, the observed electric field-induced magnetization reversal can be used for the construction of energy-efficient spintronic devices, e.g., low-power electric-write and magnetic-read memories.

  17. Single-crystalline BaTiO3 films grown by gas-source molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Matsubara, Yuya; Takahashi, Kei S.; Tokura, Yoshinori; Kawasaki, Masashi

    2014-12-01

    Thin BaTiO3 films were grown on GdScO3 (110) substrates by metalorganic gas-source molecular beam epitaxy. Titanium tetra-isopropoxide (TTIP) was used as a volatile precursor that provides a wide growth window of the supplied TTIP/Ba ratio for automatic adjustment of the film composition. Within the growth window, compressively strained films can be grown with excellent crystalline quality, whereas films grown outside of the growth window are relaxed with inferior crystallinity. This growth method will provide a way to study the intrinsic properties of ferroelectric BaTiO3 films and their heterostructures by precise control of the stoichiometry, structure, and purity.

  18. Field electron emission of diamond films grown on the ultrasonically scratched and nano-seeded Si substrates

    NASA Astrophysics Data System (ADS)

    Jiang, N.; Nishimura, K.; Shintani, Y.; Hiraki, A.

    2003-07-01

    In the present study, we compare the field emission properties of diamond films grown on ultrasonically scratched and nano-seeded Si substrates. The diamond films were fabricated in a microwave plasma chemical vapor deposition system. It is confirmed that these two kinds of pretreatment methods, scratched or nano-seeded, result in rather different field emission properties. The diamond films grown on the ultrasonically scratched Si substrates present much higher emission current and lower threshold field than those of the films grown on the nano-seeded substrates. Cross-sectional transmission electron microscopy has been employed to evaluate the diamond films, and the field electron emission behaviors are analyzed in relation to the interface structures.

  19. Epitaxially grown BaM hexaferrite films having uniaxial axis in the film plane for self-biased devices

    NASA Astrophysics Data System (ADS)

    Zhang, Xiaozhi; Meng, Siqin; Song, Dongsheng; Zhang, Yao; Yue, Zhenxing; Harris, Vincent G.

    2017-03-01

    Barium hexaferrite (BaM) films with in-plane c-axis orientation are promising and technically important materials for self-biased magnetic microwave devices. In this work, highly oriented BaM films with different thickness and an in-plane easy axis (c-axis) of magnetization were grown on a-plane single-crystal sapphire substrates by direct current magnetron sputtering. A procedure involving seed layers, layer-by-layer annealing was adopted to reduce the substrate-induced strains and allow for the growth of thick (~3.44 μm) films. The epitaxial growth of the BaM film on sapphire was revealed by high-resolution transmission electron microscopy with dislocations being observed at the film-substrate interface. The orientation was also verified by X-ray diffraction and more notably, polarized Raman scattering. The magnetic properties and ferromagnetic resonant frequencies were experimentally characterized by a vibrating sample magnetometry and a frequency-swept ferromagnetic resonant flip-chip technique, respectively. The micron-thick BaM films exhibited a large remanence ratio of 0.92 along in-plane easy axis and a small one of 0.09 for the in-plane hard axis loop measurement. The FMR frequency was 50.3 GHz at zero field and reached 57.9 GHz under a magnetic field of 3 kOe, indicating that the epitaxial BaM films with strong self-biased behaviors have good electromagnetic properties in millimeter-wave range.

  20. Epitaxially grown BaM hexaferrite films having uniaxial axis in the film plane for self-biased devices

    PubMed Central

    Zhang, Xiaozhi; Meng, Siqin; Song, Dongsheng; Zhang, Yao; Yue, Zhenxing; Harris, Vincent G.

    2017-01-01

    Barium hexaferrite (BaM) films with in-plane c-axis orientation are promising and technically important materials for self-biased magnetic microwave devices. In this work, highly oriented BaM films with different thickness and an in-plane easy axis (c-axis) of magnetization were grown on a-plane single-crystal sapphire substrates by direct current magnetron sputtering. A procedure involving seed layers, layer-by-layer annealing was adopted to reduce the substrate-induced strains and allow for the growth of thick (~3.44 μm) films. The epitaxial growth of the BaM film on sapphire was revealed by high-resolution transmission electron microscopy with dislocations being observed at the film-substrate interface. The orientation was also verified by X-ray diffraction and more notably, polarized Raman scattering. The magnetic properties and ferromagnetic resonant frequencies were experimentally characterized by a vibrating sample magnetometry and a frequency-swept ferromagnetic resonant flip-chip technique, respectively. The micron-thick BaM films exhibited a large remanence ratio of 0.92 along in-plane easy axis and a small one of 0.09 for the in-plane hard axis loop measurement. The FMR frequency was 50.3 GHz at zero field and reached 57.9 GHz under a magnetic field of 3 kOe, indicating that the epitaxial BaM films with strong self-biased behaviors have good electromagnetic properties in millimeter-wave range. PMID:28276492

  1. Extraordinarily large perpendicular magnetic anisotropy in epitaxially strained cobalt-ferrite Co{sub x}Fe{sub 3−x}O{sub 4}(001) (x = 0.75, 1.0) thin films

    SciTech Connect

    Niizeki, Tomohiko; Utsumi, Yuji; Aoyama, Ryohei; Yanagihara, Hideto; Inoue, Jun-ichiro; Kita, Eiji; Yamasaki, Yuichi; Nakao, Hironori; Koike, Kazuyuki

    2013-10-14

    Perpendicular magnetic anisotropy (PMA) of cobalt-ferrite Co{sub x}Fe{sub 3-x}O{sub 4} (x = 0.75 and 1.0) epitaxial thin films grown on MgO (001) by a reactive magnetron sputtering technique was investigated. The saturation magnetization was found to be 430 emu/cm{sup 3} for x = 0.75, which is comparable to that of bulk CoFe{sub 2}O{sub 4} (425 emu/cm{sup 3}). Torque measurements afforded PMA constants of K{sub u}{sup eff}=9.0 Merg/cm{sup 3} (K{sub u}=10.0 Merg/cm{sup 3}) and K{sub u}{sup eff}=9.7 Merg/cm{sup 3} for x = 0.75 and 1.0, respectively. The value of K{sub u}{sup eff} extrapolated using Miyajima's plot was as high as 14.7 Merg/cm{sup 3} for x = 1.0. The in-plane four-fold magnetic anisotropy was evaluated to be 1.6 Merg/cm{sup 3} for x = 0.75. X-ray diffraction measurement revealed our films to be pseudomorphically strained on MgO (001) with a Poisson ratio of 0.4, leading to a considerable in-plane tensile strain by which the extraordinarily large PMA could be accounted for.

  2. Cyclotron resonance in epitaxial Bi1-xSbx films grown by molecular-beam epitaxy

    NASA Astrophysics Data System (ADS)

    Heremans, J.; Partin, D. L.; Thrush, C. M.; Karczewski, G.; Richardson, M. S.; Furdyna, J. K.

    1993-10-01

    The far-infrared magnetotransmission of thin films of semiconducting and semimetallic Bi1-xSbx alloys grown by molecular-beam epitaxy has been measured at fixed photon energies between 2.5 and 21.4 meV in magnetic fields up to 6 T, at T=1.8 K. The samples, grown on BaF2 substrates with composition 0<=x<=22.5%, were monocrystalline, with the trigonal axis perpendicular to the surface plane. The measurements were carried out in Faraday and Voigt geometries, with the magnetic field oriented parallel to binary, bisectrix, and trigonal axes of the films. Cyclotron-resonance lines of both electrons and holes were observed. From them, we establish the composition dependence of the effective-mass tensor, of the direct L-point band gap, and of the energy overlap in the semimetallic samples. We conclude that all band-structure parameters are the same in the films as in bulk Bi1-xSbx alloys, except for the energy overlap, which is increased by 16 meV independently of composition, possibly because of the strain induced by the substrate.

  3. High resolution transmission electron microscopy study of diamond films grown from fullerene precursors

    SciTech Connect

    Luo, J.S.; Gruen, D.M.; Krauss, A.R.

    1995-07-01

    High-resolution transmission electron microscopy (HRTEM) has been used to investigate the microstructure of diamond films grown by plasma-assisted chemical vapor deposition using fullerene precursors. HRTEM observations of as-grown films revealed an array of larger crystals (>200 nm) within a polycrystalline matrix of much smaller crystallites (<20 nm). The randomly oriented small crystallites were nearly free of structural imperfections such as stacking faults or twins, while the larger ones had preferred <110> orientations with respect to the Si (100) substrate and showed evidence of structural defects on the periphery of the crystals. The most common defects were V-shaped {Sigma}9 twin boundaries, which are generally believed to serve as re-entrant sites for diamond nucleation and growth. The observation of growth steps on both (111) and (110) surfaces seems to support a reaction model in which fragments of C{sub 60}, including C{sub 2}, are considered the growth species. In particular, the nanocrystallinity of the films is most likely due to a high carbon cluster density from C{sub 60} fragmentation at or near the diamond surface, which can serve as nucleation sites for the growth of new crystallites.

  4. Epitaxially-Grown Europium-Doped Barium Titanate Films on Various Substrates for Red Emission.

    PubMed

    Hwang, Kyu-Seog; Jeon, Young-Sun; Lee, Young-Hwan; Hwangbo, Seung; Kim, Jin-Tae

    2015-10-01

    Intense red photoluminescence under ultraviolet excitation was observed in epitaxially-grown europium-doped perovskite BaTiO3 thin films deposited on the SrTiO3 (100), MgO (100) and sapphire (0001) substrates using metal carboxylate complexes. Precursor films prepared by spin coating were pyrolyzed at 250 °C for 120 min in argon, followed by final annealing at 850 °C for 60 min in argon. Crystallinity and epitaxy of the films were analyzed by X-ray diffraction θ-2θ scan and pole-figure analysis. Photoluminescence of the thin films at room temperature under 254 nm was confirmed by a fluorescent spectrophotometer. The obtained epitaxial BaTiO3 thin films on the SrTiO3 (100) and MgO (100) substrates show an intense red-emission lines at 615 nm corresponding to the (5)D0 --> (7)F2 transitions on Eu(3+) with broad bands at 595 and 650 nm.

  5. Factors that determine the presence of particles in YBCO films grown by PLD

    NASA Astrophysics Data System (ADS)

    Barrales-Guadarrama, V. R.; Rodríguez-Rodríguez, E. M.; Barrales-Guadarrama, R.; Reyes Ayala, N.

    2017-01-01

    The method of growing thin films PLD, is widely used in applications and possesses great potential in thin YBa2Cu3O7-δ films production with outstanding physical properties. However, it is limited in nano and micro technology due to the presence of particles on the surface of the films. This article describes some causes that create these particles. YBa2Cu3O7-δ films have been grown on electrolytic copper used as a variable model the distance target-substrate. The effects are studied through Scanning Electronic Microscopy. It is observed particles with a large variety of shapes and distributions. The results show that ranging the target-substrate distance, the superficial morphology is modified. An evidence of it, is that the evaporation of dB-S = 7 cm, is more coherent that dB-S = 3 cm. Therefore, exist a relation between the morphology and the parameters of growing. Also affect, the structural change that exists among the substrate and the film formation, the substrate preparation and it must not be monocrystalline, these factors define a kinetic and a mechanism of growing that promotes a heterogeneous nucleation.

  6. Photoluminescence of localized excitons in ZnCdO thin films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Wu, T. Y.; Huang, Y. S.; Hu, S. Y.; Lee, Y. C.; Tiong, K. K.; Chang, C. C.; Shen, J. L.; Chou, W. C.

    2016-07-01

    We have investigated the luminescence characteristics of Zn1-xCdxO thin films with different Cd contents grown by molecular beam epitaxy system. The temperature-dependent photoluminescence (PL) and excitation power-dependent PL spectra were measured to clarify the luminescence mechanisms of the Zn1-xCdxO thin films. The peak energy of the Zn1-xCdxO thin films with increasing the Cd concentration is observed as redshift and can be fitted by the quadratic function of alloy content. The broadened full-width at half-maximum (FWHM) estimated from the 15 K PL spectra as a function of Cd content shows a larger deviation between the experimental values and theoretical curve, which indicates that experimental FWHM values are affected not only by alloy compositional disorder but also by localized excitons occupying states in the tail of the density of states. The Urbach energy determined from an analysis of the lineshape of the low-energy side of the PL spectrum and the degree of localization effect estimated from the temperature-induced S-shaped PL peak position described an increasing mean exciton-localization effects in ZnCdO films with increasing the Cd content. In addition, the PL intensity and peak position as a function of excitation power are carried out to clarify the types of radiative recombination and the effects of localized exciton in the ZnCdO films with different Cd contents.

  7. Transparent conductive Al-doped ZnO thin films grown at room temperature

    SciTech Connect

    Wang Yuping; Lu Jianguo; Bie Xun; Gong Li; Li Xiang; Song Da; Zhao Xuyang; Ye Wenyi; Ye Zhizhen

    2011-05-15

    Aluminum-doped ZnO (ZnO:Al, AZO) thin films were prepared on glass substrates by dc reactive magnetron sputtering from a Zn-Al alloy target at room temperature. The effects of the Ar-to-O{sub 2} partial pressure ratios on the structural, electrical, and optical properties of AZO films were studied in detail. AZO films grown using 100:4 to 100:8 Ar-to-O{sub 2} ratio result in acceptable quality films with c-axis orientated crystals, uniform grains, 10{sup -3} {Omega} cm resistivity, greater than 10{sup 20} cm{sup -3} electron concentration, and high transmittance, 90%, in the visible region. The lowest resistivity of 4.11x10{sup -3} {Omega} cm was obtained under the Ar-to-O{sub 2} partial pressure ratio of 100:4. A relatively strong UV emission at {approx}3.26 eV was observed in the room-temperature photoluminescence spectrum. X-ray photoelectron spectroscopy analysis confirmed that Al was introduced into ZnO and substitutes for Zn and doped the film n-type.

  8. Heteroepitaxial film silicon solar cell grown on Ni-W foils

    SciTech Connect

    Wee, Sung Hun; Cantoni, Claudia; Fanning, Thomas; Teplin, Charles; Bogorin, Daniela Florentina; Bornstein, Jon; Bowers, Karen; Schroeter,; Hasoon, Falah; Branz, Howard; Paranthaman, Mariappan Parans; Goyal, Amit

    2013-01-01

    Today, silicon-wafer-based technology dominates the photovoltaic (PV) industry because it enables high efficiency, is produced from abundant, non-toxic materials and is proven in the PV marketplace.[1] However, costs associated with the wafer itself limit ultimate cost reductions.[1,2] PV based on absorber layers of crystalline Si with only 2 to 10 m thickness are a promising route to reduce these costs, while maintaining efficiencies above 15%.[3-5] With the goal of fabricating low-cost film crystalline Si (c-Si), recent research has explored wafer peeling,[6,7] crystallization of amorphous silicon films on glass,[4,8-10] and seed and epitaxy approaches.[3,5,11] In this third approach, one initially forms a seed layer that establishes the grain size and crystalline order. The Si layer is then grown heteroepitaxially on the seed layer, so that it replicates the seed crystal structure. In all of these film c-Si approaches, the critical challenge is to grow c-Si with adequate material quality: specifically, the diffusion length (LD) must be at least three times the film thickness.[12] In polycrystalline Si films, grain boundaries (GBs) are recombination-active and significantly reduce LD. This adverse effects of GBs motivates research into growth of large grained c-Si [13,14] (for a low density of GBs) and biaxially-textured c-Si [11] (for low-angle GBs).

  9. The temperature dependence of the electrical conductivity in Cu2O thin films grown by magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Kudryashov, D.; Gudovskikh, A.; Zelentsov, K.; Mozharov, A.; Babichev, A.; Filimonov, A.

    2016-08-01

    The temperature dependence of the electrical conductivity in Cu2O thin films grown by magnetron sputtering at room temperature under different rf-power was investigated. Calculated activation energy of the conductivity for copper oxide (I) films linearly increases with increase in sputtering power reflecting an increasing in concentration of gap states.

  10. Structure Dependence of Magnetic Properties for Annealed GaMnN Films Grown by MOCVD

    NASA Astrophysics Data System (ADS)

    Jiang, Xian-Zhe; Yang, Xue-Lin; Ji, Cheng; Xing, Hai-Ying; Yang, Zhi-Jian; Wang, Cun-Da; Yu, Tong-Jun; Zhang, Guo-Yi

    2014-06-01

    GaMnN/GaN multilayers and conventional GaMnN single layers are grown by metal-organic chemical vapor deposition. Both kinds of samples show room-temperature ferromagnetism. After thermal annealing, the sample with GaMnN/GaN multilayer structure displays a larger coercivity and better thermal stability compared to the GaMnN single layer. The annealing effects on VGa related defects are observed from photoluminescence measurements. Moreover, a different magnetic behavior is also found in the annealed GaMnN films grown on different (n-type GaN and p-type GaN) templates. These kinds of structure-dependent magnetic behaviors indicate that defects or carriers transformation introduced during annealing may have important effects on the electronic structure of Mn ions and on the ferromagnetism. Our work may be helpful for further understanding the origin of ferromagnetism in GaN-based diluted magnetic semiconductors.

  11. Acceptor states in heteroepitaxial CdHgTe films grown by molecular-beam epitaxy

    SciTech Connect

    Mynbaev, K. D.; Shilyaev, A. V. Bazhenov, N. L.; Izhnin, A. I.; Izhnin, I. I.; Mikhailov, N. N.; Varavin, V. S.; Dvoretsky, S. A.

    2015-03-15

    The photoluminescence method is used to study acceptor states in CdHgTe heteroepitaxial films (HEFs) grown by molecular-beam epitaxy. A comparison of the photoluminescence spectra of HEFs grown on GaAs substrates (CdHgTe/GaAs) with the spectra of CdHgTe/Si HEFs demonstrates that acceptor states with energy depths of about 18 and 27 meV are specific to CdHgTe/GaAs HEFs. The possible nature of these states and its relation to the HEF synthesis conditions and, in particular, to the vacancy doping occurring under conditions of a mercury deficiency during the course of epitaxy and postgrowth processing are discussed.

  12. The magnetic and chemical structural property of the epitaxially-grown multilayered thin film

    NASA Astrophysics Data System (ADS)

    Lee, Hwachol

    L10 FePt- and Fe-related alloys such as FePtRh, FeRh and FeRhPd have been studied for the high magnetocrystalline anisotropy and magnetic phase transition property for the future application. In this work, the thin film structural and magnetic property is investigated for the selected FePtRh and FeRhPd alloys. The compositionally-modulated L10 FePtRh multilayered structure is grown epitaxially on a-plane Al2O3 with Cr and Pt buffer layer at 600degC growth temperature by DC sputtering technique and examined for the structural, interfacial and magnetic property. For the epitaxially grown L10 [Fe50Pt45Rh5 (FM) (10nm) / Fe50Pt25Rh25 (AFM) (20nm)]x8 superlattice, the magnetically and chemically sharp interface formation between layers was observed in X-ray diffraction, transmission electron microscopy and polarized neutron reflectivity measurements with the negligible exchange bias at room and a slight coupling effect at lower temperature regime. For FeRhPd, the magnetic phase transition of epitaxially-grown 111-oriented Fe46Rh48Pd6 thin film is studied. The applied Rhodium buffer layer on a-plane Al2O3 (11 20) at 600degC shows the extraordinarily high quality of epitaxial film in (111) orientation, where two broad and coherent peak in rocking curve, and Laue oscillations are observed. The epitaxially-grown Pd-doped FeRh on Pt (111) grown at 600degC, 700degC exhibits the co-existing stable L10 (111) and B2 (110) structures and magnetic phase transition around 300degC. On the other hand, the partially-ordered FeRhPd structure grown at 400degC, 500degC shows background high ferromagnetic state over 5K˜350K temperature. For the reduced thickness of Fe46Rh48Pd 6, the ferromagnetic state becomes dominant with a reduced portion of the film undergoing a magnetic phase transition. For some epitaxial FeRhPd film, the spin-glass-like disordered state is also observed in field dependent SQUID measurement. For the tri-layered FeRhPd with thin Pt spacer, the background

  13. Extended wide band gap amorphous aluminium-doped zinc oxide thin films grown at liquid nitrogen temperature

    NASA Astrophysics Data System (ADS)

    Chou, H.; Yang, M. S.; Wu, C. P.; Tsao, Y. C.; Chen, B. J.; Liao, T. F.; Sun, S. J.; Chiou, J. W.

    2011-05-01

    Amorphous aluminium-doped zinc oxide (AZO) thin films are grown by standard RF sputtering at low temperatures on glass substrates. Due to poor thermal conductivity and thermal energy generated by the sputter gun, controlling the substrate surface temperature is the key to controlling the growth of amorphous and nanocrystalline films. The ratio of grains and amorphous part of the films can be controlled by selective growth conditions. During a transmission electron microscope (TEM) inspection process, the amorphous films react immediately and strongly with an electron beam and transform to a mixture of amorphous and nanocrystalline phases. The films having a mixture of amorphous and nanocrystalline phases, either as-grown or after transformation by irradiation of the electron beam, are stable in the TEM inspection, indicating that the low interface energy stabilizes the mixture phase. The optical band gap increases with the content of amorphous phase and is 4.3 eV for pure amorphous AZO films.

  14. Properties of CsI, CsBr and GaAs thin films grown by pulsed laser deposition

    SciTech Connect

    Brendel, V M; Garnov, S V; Yagafarov, T F; Iskhakova, L D; Ermakov, R P

    2014-09-30

    CsI, CsBr and GaAs thin films have been grown by pulsed laser deposition on glass substrates. The morphology and structure of the films have been studied using X-ray diffraction and scanning electron microscopy. The CsI and CsBr films were identical in stoichiometry to the respective targets and had a polycrystalline structure. Increasing the substrate temperature led to an increase in the density of the films. All the GaAs films differed in stoichiometry from the target. An explanation was proposed for this fact. The present results demonstrate that, when the congruent transport condition is not fulfilled, films identical in stoichiometry to targets can be grown by pulsed laser deposition in the case of materials with a low melting point and thermal conductivity. (interaction of laser radiation with matter)

  15. Synthesis and characterization of hexagonal ferrite Sr1.8Sm0.2Co2Ni1.50Fe10.50O22/PST thin films for high frequency application

    NASA Astrophysics Data System (ADS)

    Ali, Irshad; Islam, M. U.; Ashiq, Muhammad Naeem; Asif Iqbal, M.; Karamat, Nazia; Azhar Khan, M.; Sadiq, Imran; Ijaz, Sana; Shakir, Imran

    2015-11-01

    Y-type hexagonal ferrite (Sr1.8Sm0.2Co2Ni1.50 Fe10.50O22) was prepared by a normal microemulsion route. The ferrite/polymer composites thin films are formed at different ferrite ratios in pure polystyrene matrix. The X-ray diffraction analysis shows broad peak at low angles which is due to the PST and the peaks for Y-type ferrite are also observed in composite samples. The peaks become more intense and show less broadening with increasing concentration of ferrite which suggests that crystallinity is improved with the addition of ferrite. DC resistivity of the composites samples is lower than that of the pure PST and decreases by increasing ferrite filler into the polymer. This decrease of resistivity is mainly due to the addition of comparatively less resistive ferrite into the highly insulating polymer matrix of PST. The observed increase in the dielectric constant (permittivity) with increasing concentration ratio of ferrites is mainly due to the electron exchange between Fe2+↔Fe3++e- which consequently results in enhancement of electric polarization as well as dielectric constant. The existence of resonances peaks in the dielectric loss tangent spectra is due to the fact when the external applied frequency becomes equal to the jumping frequency of electrons between Fe2+ and Fe3+. The increasing behavior of the dielectric constant, dielectric loss and AC conductivity with increasing ferrite ratio in PST matrix proposes their versatile use in different technological applications especially for electromagnetic shielding.

  16. Structural, Electrical and Dielectric Properties of Li-Ni Ferrite-Polystyrene Thin Film Nano-Composites

    NASA Astrophysics Data System (ADS)

    Ali, Hassan; Islam, M. U.; Ali, Irshad; Ashiq, Muhammad Naeem; Ramay, Shahid M.; Mahmood, Asif

    2017-08-01

    Lithium nickel ferrite Li0.5Ni0.5Fe2O4 was synthesized by the sol-gel auto combustion method. The prepared ferrite was mixed with polystyrene with ratio 0.25:1(FP1), 0.50:1(FP2), 0.75:1(FP3) and 1:1(FP4) to get ferrite-polystyrene composite. The synthesized samples were characterized by x-ray diffraction, dielectric and direct current resistivity measurements. The x-ray diffraction pattern shows that the polystyrene is amorphous in nature. The diffraction peaks of ferrite-polystyrene composite become sharper and narrower by increasing the ferrite filler contents. Room temperature resistivity of the composites decreased significantly from 4.63 × 1013 Ω-cm to 3.67 × 109 Ω-cm with increasing ferrite content and temperature dependent resistivity decreased with increasing temperature. The dielectric constant increased as the concentration of ferrite was increased in the base sample. A maximum value of 23.60 was achieved for the last sample. Conversely, the increase in frequency results from the decrease in dielectric constant followed the Maxwell-Wagner model.

  17. Post-growth annealing of low temperature-grown Sb-doped Si molecular beam epitaxial films

    NASA Astrophysics Data System (ADS)

    Hobart, K. D.; Godbey, D. J.; Thompson, P. E.

    1992-07-01

    Sb-doped Si films have been grown on (100) Si substrates at low temperature (˜350 °C) by molecular beam epitaxy. Through coevaporation with Sb, very high doping efficiencies were achieved over a carrier concentration range of 1×1017 to 1×1020 cm-3. Through calibration of the beam flux we found that the incorporation of Sb was very near unity up to a concentration of ˜5×1019 cm-3. As-grown films are of good quality. However, furnace annealing was shown to improve the mobility and completely activate the Sb. Temperature dependent Hall measurements were used to further characterize the films.

  18. High frequency capacitance-voltage characteristics of thermally grown SiO2 films on beta-SiC

    NASA Technical Reports Server (NTRS)

    Tang, S. M.; Berry, W. B.; Kwor, R.; Zeller, M. V.; Matus, L. G.

    1990-01-01

    Silicon dioxide films grown under dry and wet oxidation environment on beta-SiC films have been studied. The beta-SiC films had been heteroepitaxially grown on both on-axis and 2-deg off-axis (001) Si substrates. Capacitance-voltage and conductance-voltage characteristics of metal-oxide-semiconductor structures were measured in a frequency range of 10 kHz to 1 MHz. From these measurements, the interface trap density and the effective fixed oxide charge density were observed to be generally lower for off-axis samples.

  19. Growth and structure of MBE grown TiO2 anatase films with rutile nano-crystallites

    SciTech Connect

    Shao, Rui; Wang, Chong M.; McCready, David E.; Droubay, Timothy C.; Chambers, Scott A.

    2007-03-15

    We have grown TiO2 anatase films with rutile nanocrystalline inclusions using molecular beam epitaxy under different growth conditions. This model system is important for investigating the role of rutile/anatase interfaces in heterogeneous photocatalysis. To control the film structure, we grew a pure anatase (001) layer at a slow rate and then increased the growth rate to drive the nucleation of rutile particles. Structure analysis indicates that the rutile phase has four preferred orientations in the anatase film.

  20. Synthesis and characterization of TiO2 nanostructure thin films grown by thermal CVD

    NASA Astrophysics Data System (ADS)

    Rizal, Umesh; Das, Soham; Kumar, Dhruva; Swain, Bhabani S.; Swain, Bibhu P.

    2016-04-01

    Thermal Chemical Vapor Deposition (CVD) deposited Titanium dioxide nanostructures (TiO2-NSs) were grown by using Ti powder and O2 precursors on Si/SiO2 (100) substrate. The microstructure and vibration properties of TiO2-NSs were characterized by Fourier transform infrared (FTIR), SEM, and photoluminescence (PL) spectroscopy. The role of O2 flow rate on TiO2-NSs revealed decreased deposition rate, however, surface roughness has been increased resulted into formation of nanostructure thin films.

  1. Resistive memory switching in ultrathin TiO{sub 2} films grown by atomic layer deposition

    SciTech Connect

    Sahu, V. K. Misra, P.; Ajimsha, R. S.; Das, A. K.; Joshi, M. P.; Kukreja, L. M.

    2016-05-23

    Electric field controlled forming free and unipolar resistive memory switching was observed in Au/TiO{sub 2}/Pt devices containing ultrathin TiO{sub 2} films of thickness ~ 4 nm grown by atomic layer deposition. These devices showed a large resistance ratio of ~ 10{sup 3} between high and low resistance states along with appreciable time retention for ~ 10{sup 4} seconds and endurance. The spread of reset and set voltages was from ~ 0.4-0.6 V and 1.1-1.5 V respectively with a clear window between them. The resistive switching mechanism was explained based on conductive filamentary model.

  2. Unexpected behaviour of one Pb monolayer deposited on aluminum oxide thin film grown on Ag(111)

    SciTech Connect

    Vizzini, Sébastien Bertoglio, M.; Oughaddou, Hamid; Hoarau, J. Y.; Biberian, J. P.; Aufray, B.

    2013-12-23

    Using scanning tunneling microscopy (STM), Auger electron spectroscopy, and low energy electron diffraction, we have observed a surprising complete dissolution at room temperature of one lead monolayer deposited by evaporation on an aluminum oxide thin film (∼0.8 nm thick) previously grown on Ag (111). We have observed the quasi-instantaneous diffusion of the lead deposit through the oxide layer to the silver/oxide interface. After the diffusion process, lead atoms form a Moiré superstructure, which is characterized by STM through the oxide layer. This unexpected behavior puts in light the very weak interaction between the aluminum oxide and the silver substrate.

  3. Continuous spin reorientation transition in epitaxially grown antiferromagnetic NiO thin films

    SciTech Connect

    Li, J.; Arenholz, E.; Meng, Y.; Tan, A.; Park, J.; Jin, E.; Son, H.; Wu, J.; Jenkins, C. A.; Scholl, A.; Hwang, Chanyong; Qiu, Z. Q.

    2011-03-01

    Fe/NiO/MgO/Ag(001) films were grown epitaxially, and the Fe and NiO spin orientations were determined using x-ray magnetic dichroism. We find that the NiO spins are aligned perpendicularly to the in-plane Fe spins. Analyzing both the in-plane and out-of-plane spin components of the NiO layer, we demonstrate unambiguously that the antiferromagnetic NiO spins undergo a continuous spin reorientation transition from the in-plane to out-of-plane directions with increasing of the MgO thickness.

  4. Tantalum films with well-controlled roughness grown by oblique incidence deposition

    NASA Astrophysics Data System (ADS)

    Rechendorff, K.; Hovgaard, M. B.; Chevallier, J.; Foss, M.; Besenbacher, F.

    2005-08-01

    We have investigated how tantalum films with well-controlled surface roughness can be grown by e-gun evaporation with oblique angle of incidence between the evaporation flux and the surface normal. Due to a more pronounced shadowing effect the root-mean-square roughness increases from about 2 to 33 nm as grazing incidence is approached. The exponent, characterizing the scaling of the root-mean-square roughness with length scale (α), varies from 0.75 to 0.93, and a clear correlation is found between the angle of incidence and root-mean-square roughness.

  5. Lutetium-doped EuO films grown by molecular-beam epitaxy

    SciTech Connect

    Melville, A.; Heeg, T.; Mairoser, T.; Schmehl, A.; Shai, D. E.; Monkman, E. J.; Harter, J. W.; Hollaender, B.; Schubert, J.; Shen, K. M.; Mannhart, J.; Schlom, D. G.

    2012-05-28

    The effect of lutetium doping on the structural, electronic, and magnetic properties of epitaxial EuO thin films grown by reactive molecular-beam epitaxy is experimentally investigated. The behavior of Lu-doped EuO is contrasted with doping by lanthanum and gadolinium. All three dopants are found to behave similarly despite differences in electronic configuration and ionic size. Andreev reflection measurements on Lu-doped EuO reveal a spin-polarization of 96% in the conduction band, despite non-magnetic carriers introduced by 5% lutetium doping.

  6. Preparation of AgInSe2 thin films grown by vacuum evaporation method

    NASA Astrophysics Data System (ADS)

    Matsuo, H.; Yoshino, K.; Ikari, T.

    2006-09-01

    Polycrystalline AgInSe2 thin films were successfully grown on glass substrates by an evaporation method. The starting materials were stoichiometrically mixed Ag2Se and In2Se3 powders. X-ray diffraction revealed that the sample annealed at 600 °C consisted of AgInSe2 single phase, with (112) orientation and a large grain size. The lattice constant (a axis) was close to JCPDS values. From optical transmittance and reflectance measurements, the bandgap energy was estimated to be 1.17 eV.

  7. Peeling off effects in vertically aligned Fe3C filled carbon nanotubes films grown by pyrolysis of ferrocene

    NASA Astrophysics Data System (ADS)

    Boi, Filippo S.; Medranda, Daniel; Ivaturi, Sameera; Wang, Jiayu; Guo, Jian; Lan, Mu; Wen, Jiqiu; Wang, Shanling; He, Yi; Mountjoy, Gavin; Willis, Maureen A. C.; Xiang, Gang

    2017-06-01

    We report the observation of an unusual self-peeling effect which allows the synthesis of free standing vertically aligned carbon nanotube films filled with large quantities of Fe3C and small quantities of γ-Fe crystals. We demonstrate that this effect depends on the interplay of three main factors: (1) the physical interactions between the chosen substrate surface and grown carbon nanotubes (CNTs), which is fixed by the composition of the used substrate (111 SiO2/Si or quartz), (2) the CNT-CNT Van der Waals interactions, and (3) the differential thermal contraction between the grown CNT film and the used substrate, which is fixed by the cooling rate differences between the grown film and the used quartz or Si/SiO2 substrates. The width and stability of these films are then further increased to cm-scale by addition of small quantities of toluene to the ferrocene precursor.

  8. Oriented Y-type hexagonal ferrite thin films prepared by chemical solution deposition

    NASA Astrophysics Data System (ADS)

    Buršík, J.; Kužel, R.; Knížek, K.; Drbohlav, I.

    2013-07-01

    Thin films of Ba2Zn2Fe12O22 (Y) hexaferrite were prepared through the chemical solution deposition method on SrTiO3(1 1 1) (ST) single crystal substrates using epitaxial SrFe12O19 (M) hexaferrite thin layer as a seed template layer. The process of crystallization was mainly investigated by means of X-ray diffraction and atomic force microscopy. A detailed inspection revealed that growth of seed layer starts through the break-up of initially continuous film into isolated grains with expressive shape anisotropy and hexagonal habit. The vital parameters of the seed layer, i.e. thickness, substrate coverage, crystallization conditions and temperature ramp were optimized with the aim to obtain epitaxially crystallized Y phase. X-ray diffraction Pole figure measurements and Φ scans reveal perfect parallel in-plane alignment of SrTiO3 substrate and both hexaferrite phases.

  9. Structural evolution of dilute magnetic (Sn,Mn)Se films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Kanzyuba, Vasily; Dong, Sining; Liu, Xinyu; Li, Xiang; Rouvimov, Sergei; Okuno, Hanako; Mariette, Henri; Zhang, Xueqiang; Ptasinska, Sylwia; Tracy, Brian D.; Smith, David J.; Dobrowolska, Margaret; Furdyna, Jacek K.

    2017-02-01

    We describe the structural evolution of dilute magnetic (Sn,Mn)Se films grown by molecular beam epitaxy on GaAs (111) substrates, as revealed by transmission electron microscopy, X-ray diffraction, and X-ray photoelectron spectroscopy. When the Mn concentration is increased, the lattice of the ternary (Sn,Mn)Se films evolves quasi-coherently from a SnSe2 two-dimensional (2D) crystal structure into a more complex quasi-2D lattice rearrangement, ultimately transforming into the magnetically concentrated antiferromagnetic MnSe 3D rock-salt structure as Mn approaches 50 at. % of this material. These structural transformations are expected to underlie the evolution of magnetic properties of this ternary system reported earlier in the literature.

  10. Structural and magnetic properties of MBE grown GeMnN2 thin films

    SciTech Connect

    Liu, Y; Lazarov, V. K.; Cheung, S.H.; Keavney, D.J.; Gai, Zheng; Gajdardziska-Josifovska, M; Weinert, M; Li, Lian

    2012-01-01

    Epitaxial GeMnN{sub 2} thin films are synthesized by plasma-assisted molecular beam epitaxy. Transmission electron microscopy and x-ray diffraction measurements confirm that it is the orthorhombic variant, consistent with the predictions of first-principles calculations. The magnetic properties of the films are related to defects, with samples grown under Ge-rich conditions exhibiting a net magnetic moment above room temperature. These results are explained by first-principles calculations, indicating that the preferential substitution of one magnetic sublattice of GeMnN{sub 2} by impurities and/or intrinsic defects such as Ge antisites produces a net magnetic moment in an antiferromagnetic background, and also introduces spin-polarized carriers near the Fermi level.

  11. Semiconductor Film Grown on a Circular Substrate: Predictive Modeling of Lattice-Misfit Stresses

    NASA Astrophysics Data System (ADS)

    Suhir, E.; Nicolics, J.; Khatibi, G.; Lederer, M.

    2016-03-01

    An effective and physically meaningful analytical predictive model is developed for the evaluation the lattice-misfit stresses (LMS) in a semiconductor film grown on a circular substrate (wafer). The two-dimensional (plane-stress) theory-of-elasticity approximation (TEA) is employed in the analysis. The addressed stresses include the interfacial shearing stress, responsible for the occurrence and growth of dislocations, as well as for possible delaminations and the cohesive strength of a buffering material, if any. Normal radial and circumferential (tangential) stresses acting in the film cross-sections and responsible for its short- and long-term strength (fracture toughness) are also addressed. The analysis is geared to the GaN technology.

  12. Characterization and Fabrication of ZnO Nanowires Grown on AlN Thin Film

    SciTech Connect

    Yousefi, Ramin; Kamaluddin, Burhanuddin; Ghoranneviss, Mahmood; Hajakbari, Fatemeh

    2009-07-07

    In this paper, we report ZnO nanowires grown on AlN thin film deposited on glass as substrate by physical vapour deposition. The temperature of substrates was kept between 600 deg. C and 500 deg. C during the growth. The typical average diameters of the obtained nanowires on substrate at 600 deg. C and 500 deg. C was about 57 nm and 22 nm, respectively with several micrometers in lengths. X-ray diffraction and Auger spectroscopy results showed Al diffused from AlN thin film into ZnO nanowires for sample at high temperature zone. In the photoluminescence spectra two emission bands appeared, one related to ultraviolet emission with a strong peak at 380-382 nm, and another related to deep level emission with a weak peak at 510 nm.

  13. In situ-grown hexagonal silicon nanocrystals in silicon carbide-based films

    PubMed Central

    2012-01-01

    Silicon nanocrystals (Si-NCs) were grown in situ in carbide-based film using a plasma-enhanced chemical vapor deposition method. High-resolution transmission electron microscopy indicates that these nanocrystallites were embedded in an amorphous silicon carbide-based matrix. Electron diffraction pattern analyses revealed that the crystallites have a hexagonal-wurtzite silicon phase structure. The peak position of the photoluminescence can be controlled within a wavelength of 500 to 650 nm by adjusting the flow rate of the silane gas. We suggest that this phenomenon is attributed to the quantum confinement effect of hexagonal Si-NCs in silicon carbide-based film with a change in the sizes and emission states of the NCs. PMID:23171576

  14. In situ-grown hexagonal silicon nanocrystals in silicon carbide-based films.

    PubMed

    Kim, Tae-Youb; Huh, Chul; Park, Nae-Man; Choi, Cheol-Jong; Suemitsu, Maki

    2012-11-21

    Silicon nanocrystals (Si-NCs) were grown in situ in carbide-based film using a plasma-enhanced chemical vapor deposition method. High-resolution transmission electron microscopy indicates that these nanocrystallites were embedded in an amorphous silicon carbide-based matrix. Electron diffraction pattern analyses revealed that the crystallites have a hexagonal-wurtzite silicon phase structure. The peak position of the photoluminescence can be controlled within a wavelength of 500 to 650 nm by adjusting the flow rate of the silane gas. We suggest that this phenomenon is attributed to the quantum confinement effect of hexagonal Si-NCs in silicon carbide-based film with a change in the sizes and emission states of the NCs.

  15. Scaling behavior of the surface roughness of platinum films grown by oblique angle deposition

    NASA Astrophysics Data System (ADS)

    Dolatshahi-Pirouz, A.; Hovgaard, M. B.; Rechendorff, K.; Chevallier, J.; Foss, M.; Besenbacher, F.

    2008-03-01

    Thin platinum films with well-controlled rough surface morphologies are grown by e-gun evaporation at an oblique angle of incidence between the deposition flux and the substrate normal. Atomic force microscopy is used to determine the root-mean-square value w of the surface roughness on the respective surfaces. From the scaling behavior of w , we find that while the roughness exponent α remains nearly unchanged at about 0.90, the growth exponent β changes from 0.49±0.04 to 0.26±0.01 as the deposition angle approaches grazing incidence. The values of the growth exponent β indicate that the film growth is influenced by both surface diffusion and shadowing effects, while the observed change from 0.49 to 0.26 can be attributed to differences in the relative importance of diffusion and shadowing with the deposition angle.

  16. Preparation and rapid thermal annealing of AlN thin films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Liu, B.; Gao, J.; Wu, K. M.; Liu, C.

    2009-05-01

    AlN films were grown at 785 ∘C on (0001) sapphire substrates by radio-frequency assisted molecular beam epitaxy. Post-growth rapid thermal annealing (RTA) was carried out from 900 to 1200 ∘C for 10 s in flowing N 2. The morphological and structural properties of the AlN epilayers before and after the RTA were studied by atomic force microscopy, x-ray diffraction and transmission electron microscopy. It is found that the threading dislocations can be decreased to an order of magnitude by using an interlayer growth method. The surface roughness (RMS) of the AlN thin films becomes larger with the increase of annealing temperature. The full width at half maximum of AlN (0002) rocking curve reaches its minimum after the RTA at 1000 ∘C.

  17. STM/STS study of graphene directly grown on h-BN films on Cu foils

    NASA Astrophysics Data System (ADS)

    Jang, Won-Jun; Wang, Min; Jang, Seong-Gyu; Kim, Minwoo; Park, Seong-Yong; Kim, Sang-Woo; Kahng, Se-Jong; Choi, Jae-Young; Song, Young; Lee, Sungjoo; Sanit Collaboration; Department Of Physics, Korea University Collaboration; Graphene Research Center, Samsung Advanced Institute Of Technology Collaboration

    2013-03-01

    Graphene-based devices on standard SiO2 substrate commonly exhibit inferior characteristics relative to the expected intrinsic properties of graphene, due to the disorder existing at graphene-SiO2 interface. Recently, it has been shown that exfoliated and chemical vapor deposition (CVD) graphene transferred onto hexagonal boron nitride (h-BN) possesses significantly reduced charge inhomogeneity, and yields improved device performance. Here we report the scanning tunneling microscopy (STM) and spectroscopy (STS) results obtained from a graphene layer directly grown on h-BN insulating films on Cu foils. STS measurements illustrate that graphene/h-BN film is charge neutral without electronic perturbation from h-BN/Cu substrate. Corresponding Author

  18. Temperature dependence of mechanical stiffness and dissipation in ultrananocrystalline diamond films grown by the HFCVD techinque.

    SciTech Connect

    Adiga, V. P.; Sumant, A. V.; Suresh, S.; Gudeman, C.; Auciello, O.; Carlisle, J. A.; Carpick, R. W.; Materials Science Division; Univ. of Pennsylvania; Innovative Micro Tech.; Advanced Diamond Tech.

    2009-06-01

    We have characterized mechanical properties of ultrananocrystalline diamond (UNCD) thin films grown using the hot filament chemical vapor deposition (HFCVD) technique at 680 C, significantly lower than the conventional growth temperature of -800 C. The films have -4.3% sp{sup 2} content in the near-surface region as revealed by near edge x-ray absorption fine structure spectroscopy. The films, -1 {micro}m thick, exhibit a net residual compressive stress of 370 {+-} 1 MPa averaged over the entire 150 mm wafer. UNCD microcantilever resonator structures and overhanging ledges were fabricated using lithography, dry etching, and wet release techniques. Overhanging ledges of the films released from the substrate exhibited periodic undulations due to stress relaxation. This was used to determine a biaxial modulus of 838 {+-} 2 GPa. Resonant excitation and ring-down measurements in the kHz frequency range of the microcantilevers were conducted under ultrahigh vacuum (UHV) conditions in a customized UHV atomic force microscope system to determine Young's modulus as well as mechanical dissipation of cantilever structures at room temperature. Young's modulus is found to be 790 {+-} 30 GPa. Based on these measurements, Poisson's ratio is estimated to be 0.057 {+-} 0.038. The quality factors (Q) of these resonators ranged from 5000 to 16000. These Q values are lower than theoretically expected from the intrinsic properties of diamond. The results indicate that surface and bulk defects are the main contributors to the observed dissipation in UNCD resonators.

  19. Growth-induced optical anisotropy of epitaxial garnet films grown on (110)-oriented substrates

    NASA Astrophysics Data System (ADS)

    Kitamura, K.; Iyi, N.; Kimura, S.; Chevrier, F.; Devignes, J. M.; Le Gall, H.

    1986-08-01

    Garnet films of nominal composition (Y,Nd)3Ga5O12, were grown on (110) 1°-off Gd3Ga5O12 substrates for investigation of their growth-induced optical anisotropy. Optical birefringence and directions of the electric vectors of polarized rays passing through the films were measured under a polarizing microscope using a Brace-Köhler compensator. The growth-induced anisotropy of these films optically exhibited orthorhombic characteristics with the X, Y, and Z optic elasticity axes coinciding with the [001], [110], and [1¯10] directions, respectively. The crystallographic data obtained by means of single-crystal diffractometry suggested that the cubic crystal system of the garnet film was distorted, though very slightly, to an orthorhombic one with a,b, and c axes that coincided, respectively, with the [1¯10],[001], and [110] of the original cubic cell. In addition, by annealing at 1150 °C, this distortion disappeared and the crystal system reverted to cubic.

  20. SPM Study and Growth Mechanism of Graphene Directly CVD-Grown on h-BN Film

    NASA Astrophysics Data System (ADS)

    Song, Young Jae; Kim, Minwoo; Wu, Qinke; Lee, Joohyun; Lee, Sungjoo; Wang, Min

    2014-03-01

    We present our Scanning Tunneling Microscopy (STM)/Spectroscopy (STS) and Kelvin Probe Force Microscope (KPFM) study for graphene directly CVD-grown on h-BN film. High resolution STM image shows perfect honeycomb lattice structure of graphene on top surface and Moiré pattern indicating the structural interference patter with the underlying h-BN crystal. Non-disturbed electronic structure of graphene on h-BN film is also confirmed by spatially-resolved STS measurements, which show very sharp and symmetric V shape with a Dirac point at Fermi level. To confirm the graphene growth mechanism on h-BN film/Cu foil, careful Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy (KPFM) measurements were performed on different thickness of h-BN film on a SiO2 substrate to unveil the catalytic origin of graphene growth on h-BN/Cu. This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Korean government (MSIP) (Grant Numbers: 2009-0083540, 2011-0030046, 2012R1A1A2020089 and 2012R1A1A1041416).

  1. Induced polarized state in intentionally grown oxygen deficient KTaO{sub 3} thin films

    SciTech Connect

    Mota, D. A.; Romaguera-Barcelay, Y.; Tkach, A.; Agostinho Moreira, J.; Almeida, A.; Perez de la Cruz, J.; Vilarinho, P. M.; Tavares, P. B.

    2013-07-21

    Deliberately oxygen deficient potassium tantalate thin films were grown by RF magnetron sputtering on Si/SiO{sub 2}/Ti/Pt substrates. Once they were structurally characterized, the effect of oxygen vacancies on their electric properties was addressed by measuring leakage currents, dielectric constant, electric polarization, and thermally stimulated depolarization currents. By using K{sub 2}O rich KTaO{sub 3} targets and specific deposition conditions, KTaO{sub 3-{delta}} oxygen deficient thin films with a K/Ta = 1 ratio were obtained. Room temperature X-ray diffraction patterns show that KTaO{sub 3-{delta}} thin films are under a compressive strain of 2.3% relative to KTaO{sub 3} crystals. Leakage current results reveal the presence of a conductive mechanism, following the Poole-Frenkel formalism. Furthermore, dielectric, polarization, and depolarization current measurements yield the existence of a polarized state below T{sub pol} {approx} 367 Degree-Sign C. A Cole-Cole dipolar relaxation was also ascertained apparently due to oxygen vacancies induced dipoles. After thermal annealing the films in an oxygen atmosphere at a temperature above T{sub pol}, the aforementioned polarized state is suppressed, associated with a drastic oxygen vacancies reduction emerging from annealing process.

  2. Rain erosion behavior of germanium carbide films grown on ZnS substrates

    NASA Astrophysics Data System (ADS)

    Mackowski, Jean-Marie; Cimma, B.; Pignard, R.; Colardelle, P.; Laprat, Patrice

    1992-12-01

    Thick germanium carbine films (GeC) are successfully grown on various Zinc Sulfide and Germanium substrates at temperatures up to 350 degree(s)C by two methods: Plasma Enhanced Chemical Vapor Deposition (PECVD) in gas mixtures of methane and germane and by Reactive Radio-Frequency Sputtering (RRFS) starting from a germanium target in a sputtering medium of methane and argon. The optical and mechanical properties of the GeC coatings depend on the composition determined by the deposition parameters. The refractive index at 633 nm varies from 4.9 to 4.3 for a carbon content ranging from 3 to 25% and the correlated refractive index in the 8 to 12 micrometers range is found to be between 3.96 and 3.1. For these coatings, the absorption coefficient is ranging from 270 to 40 cm-1. All films are amorphous in nature with domains ranging from 13 to 20 angstroms. The hydrogen content varies from 2 to 25% coming from C:H, Ge:H and C:Ge:H bonding. The XPS analysis shows the Ge:C precipitation kinetic for high deposition temperature or annealed films. The rain erosion resistance of GeC films and GeC with a protective diamond like-carbon (DLC) coating on top is measured for 1.2 mm water drop with an impact velocity ranging from 210 to 265 m/s on the Saab-Scania whirling-arm rig (Linkoping, Sweden).

  3. Variable range hopping crossover and magnetotransport in PLD grown Sb doped ZnO thin film

    NASA Astrophysics Data System (ADS)

    Mukherjee, Joynarayan; Mannam, Ramanjaneyulu; Ramachandra Rao, M. S.

    2017-04-01

    We report on the variable range hopping (VRH) crossover in the electrical transport of Sb doped ZnO (SZO) thin film. Structural, chemical, electrical and magnetotransport properties were carried out on SZO thin film grown by pulsed laser deposition. X-photoelectron spectroscopy study confirms the presence of both Sb3+(33%) and Sb5+(67%) states. Sb doped ZnO thin film shows n-type behavior which is attributed to the formation of SbZn and/or SbZn–VZn defect complex. Temperature dependent resistivity measurement showed that in a low temperature regime (< 90 K) transport is governed by the 3D-VRH mechanism. A crossover from 3D-VRH to Efros–Shklovoski VRH was observed around 12 K. Negative magnetoresistance (MR) is observed in the entire temperature range (300–5 K), however, there is an upturn in the MR behavior at 5 K suggesting the existence of a positive component. The MR behavior of Sb doped ZnO thin films is explained by the Khosla and Fischer model.

  4. Spectroscopic characterization of high-purity polycrystalline Bi-Te films grown by thermal evaporation

    NASA Astrophysics Data System (ADS)

    Rapacz, Rafał; Balin, Katarzyna; Nowak, Anna; Szade, Jacek

    2014-09-01

    Thin films of BixTey with various compositions have been grown on Si(100) substrates by thermal evaporation with the use of a Molecular Beam Epitaxy (MBE) system. The growth was performed in the co-deposition mode. The effect of stoichiometry and growth conditions on the structural and electronic properties of the films was studied. Films with compositions corresponding to the compound Bi2Te3 and with compositions rich in Te and Bi were studied. Two different phases which crystallized in the hexagonal family were recognized: trigonal Bi2Te3 with the lattice parameters of a=4.44 Å and c=30.47 Å and hexagonal BiTe with the lattice parameters of a=4.39 Å and c=24.02 Å. The analysis of photoemission from the Bi and Te core levels confirmed the structural studies. The layered structure of BixTey films caused that the found crystal phases are accompanied by layers of pure elements Te or Bi depending on the stoichiometry. Angle dependent photoelectron spectroscopy studies showed the tendency of segregation direction - towards the surface for Te layers and opposite one for metallic Bi.

  5. Characterization of amorphous carbon films grown by pulsed-laser deposition

    SciTech Connect

    Siegal, M.P.; Tallant, D.R.; Barbour, J.C.; Provencio, P.N.; Martinez-Miranda, L.J.; DiNardo, N.J.

    1998-09-01

    Amorphous carbon (a-C) films grow via energetic processes such as pulsed-laser deposition (PLD). The cold-cathode electron emission properties of a-C are promising for flat-panel display and vacuum microelectronics technologies. These ultrahard films consist of a mixture of 3-fold and 4-fold coordinated carbon atoms, resulting in an amorphous material with diamond-like properties. The authors study the structures of a-C films grown at room temperature as a function of PLD energetics using x-ray reflectivity, Raman spectroscopy, high-resolution transmission electron microscopy, and Rutherford backscattering spectrometry. While an understanding of the electron emission mechanism in a-C films remains elusive, the onset of emission is typically preceded by conditioning where the material is stressed by an applied electric field. To simulate conditioning and assess its effect, the authors use the spatially-localized field and current of a scanning tunneling microscope tip. Scanning force microscopy shows that conditioning alters surface morphology and electronic structure. Spatially-resolved electron energy loss spectroscopy indicates that the predominant bonding configuration changes from predominantly 4-fold to 3-fold coordination.

  6. Thermal stability of MBE-grown epitaxial MoSe2 and WSe2 thin films

    NASA Astrophysics Data System (ADS)

    Chang, Young Jun; Choy, Byoung Ki; Phark, Soo-Hyon; Kim, Minu

    Layered transition metal dichalcogenides (TMDs) draw much attention, because of its unique optical properties and band structures depending on the layer thicknesses. However, MBE growth of epitaxial films demands information about thermal stability of stoichiometry and related electronic structure for high temperature range. We grow epitaxial MoSe2 and WSe2 ultrathin films by using molecular beam epitaxy (MBE). We characterize stoichiometry of films grown at various growth temperature by using various methods, XPS, EDX, and TOF-MEIS. We further test high temperature stability of electronic structure for those films by utilizing in-situ ellipsometry attached to UHV chamber. We discuss threshold temperatures up to 700~1000oC, at which electronic phases changes from semiconductor to metal due to selenium deficiency. This information can be useful for potential application of TMDs for fabrication of Van der Waals multilayers and related devices. This research was supported by Nano.Material Technology Development Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT and Future Planning. (2009-0082580), NRF-2014R1A1A1002868.

  7. Electrochromism and photocatalysis in dendrite structured Ti:WO3 thin films grown by sputtering

    NASA Astrophysics Data System (ADS)

    Karuppasamy, A.

    2015-12-01

    Titanium doped tungsten oxide (Ti:WO3) thin films with dendrite surface structures were grown by co-sputtering titanium and tungsten in Ar + O2 atmosphere. Ti:WO3 thin films were deposited at oxygen flow rates corresponding to pressures in the range 1.0 × 10-3-5.0 × 10-3 mbar. Argon flow rate and sputtering power densities for titanium (2 W/cm2) and tungsten (3 W/cm2) were kept constant. Ti:WO3 films deposited at an oxygen pressure of 5 × 10-3 mbar are found to be better electrochromic and photocatalytic. They have high optical modulation (80% at λ = 550 nm), coloration efficiency (60 cm2/C at λ = 550 nm), electron/ion storage and removal capacity (Qc: -22.01 mC/cm2, Qa: 17.72 mC/cm2), reversibility (80%) and methylene blue decomposition rate (-1.38 μmol/l d). The combined effects of titanium doping, dendrite surface structures and porosity leads to significant enhancement in the electrochromic and photocatalytic properties of Ti:WO3 films.

  8. Orientation epitaxy of Ge1–xSnx films grown on single crystal CaF2 substrates

    DOE PAGES

    A. J. Littlejohn; Zhang, L. H.; Lu, T. -M.; ...

    2016-03-15

    Ge1–xSnx films were grown via physical vapor deposition below the crystallization temperature of Ge on single crystal (111) and (100) CaF2 substrates to assess the role of Sn alloying in Ge crystallization. By studying samples grown at several growth temperatures ranging from 250 °C to 400 °C we report temperature-dependent trends in several of the films' properties. X-ray diffraction theta vs. two-theta (θ/2θ) scans indicate single orientation Ge1–xSnx(111) films are grown on CaF2(111) substrates at each temperature, while a temperature-dependent superposition of (111) and (100) orientations are exhibited in films grown on CaF2(100) above 250 °C. This is the firstmore » report of (111) oriented Ge1–xSnx grown on a (100) oriented CaF2 substrate, which is successfully predicted by a superlattice area matching model. These results are confirmed by X-ray diffraction pole figure analysis. θ/2θ results indicate substitutional Sn alloying in each film of about 5%, corroborated by energy dispersive spectroscopy. In addition, morphological and electrical properties are measured by scanning electron microscopy, atomic force microscopy and Hall mobility measurements and are also shown to be dependent upon growth temperature.« less

  9. Spatial modulation of in-plane magnetic anisotropy in epitaxial Co(111) films grown on macrostep-bunched Si(111)

    SciTech Connect

    Davydenko, A. V. Kozlov, A. G.; Chebotkevich, L. A.

    2014-10-14

    We compared magnetic properties of epitaxial Co(111) films grown on microstep- and macrostep-bunched vicinal Si(111) substrates. A surface of the microstep-bunched Si(111) substrate represents regular array of step-bunches with height of 1.7 nm divided from each other by flat microterraces with a width of 34 nm. A surface of the macrostep-bunched Si(111) substrate is constituted by macrostep bunches with a height of 75–85 nm divided by atomically flat macroterraces. The average sum width of a macrostep bunch and a macroterrace is 2.3 μm. While in-plane magnetic anisotropy was spatially uniform in Co(111) films grown on the microstep-bunched Si(111), periodic macromodulation of the topography of the Si(111) substrate induced spatial modulation of in-plane magnetic anisotropy in Co(111) film grown on the macrostep-bunched Si(111) surface. The energy of uniaxial magnetic anisotropy in the areas of the Co(111) film deposited on the Si(111) macrosteps was higher more than by the order of magnitude than the energy of the magnetic anisotropy in the areas grown on macroterraces. Magnetization reversal in the areas with different energy of the magnetic anisotropy occurred in different magnetic fields. We showed the possibility of obtaining high density of domain walls in Co(111) film grown on the macrostep-bunched Si(111) by tuning the spatial step density of the Si(111) substrate.

  10. Heterojunction oxide thin-film transistors with unprecedented electron mobility grown from solution

    PubMed Central

    Faber, Hendrik; Das, Satyajit; Lin, Yen-Hung; Pliatsikas, Nikos; Zhao, Kui; Kehagias, Thomas; Dimitrakopulos, George; Amassian, Aram; Patsalas, Panos A.; Anthopoulos, Thomas D.

    2017-01-01

    Thin-film transistors made of solution-processed metal oxide semiconductors hold great promise for application in the emerging sector of large-area electronics. However, further advancement of the technology is hindered by limitations associated with the extrinsic electron transport properties of the often defect-prone oxides. We overcome this limitation by replacing the single-layer semiconductor channel with a low-dimensional, solution-grown In2O3/ZnO heterojunction. We find that In2O3/ZnO transistors exhibit band-like electron transport, with mobility values significantly higher than single-layer In2O3 and ZnO devices by a factor of 2 to 100. This marked improvement is shown to originate from the presence of free electrons confined on the plane of the atomically sharp heterointerface induced by the large conduction band offset between In2O3 and ZnO. Our finding underscores engineering of solution-grown metal oxide heterointerfaces as an alternative strategy to thin-film transistor development and has the potential for widespread technological applications. PMID:28435867

  11. Atomic Layer Deposition (ALD) grown thin films for ultra-fine pitch pixel detectors

    NASA Astrophysics Data System (ADS)

    Härkönen, J.; Ott, J.; Mäkelä, M.; Arsenovich, T.; Gädda, A.; Peltola, T.; Tuovinen, E.; Luukka, P.; Tuominen, E.; Junkes, A.; Niinistö, J.; Ritala, M.

    2016-09-01

    In this report we cover two special applications of Atomic Layer Deposition (ALD) thin films to solve these challenges of the very small size pixel detectors. First, we propose to passivate the p-type pixel detector with ALD grown Al2O3 field insulator with a negative oxide charge instead of using the commonly adopted p-stop or p-spray technologies with SiO2, and second, to use plasma-enhanced ALD grown titanium nitride (TiN) bias resistors instead of the punch through biasing structures. Surface passivation properties of Al2O3 field insulator was studied by Photoconductive Decay (PCD) method and our results indicate that after appropriate annealing Al2O3 provides equally low effective surface recombination velocity as thermally oxidized Si/SiO2 interface. Furthermore, with properly designed annealing steps, the TiN thin film resistors can be tuned to have up to several MΩ resistances with a few μm of physical size required in ultra-fine pitch pixel detectors.

  12. Defects Induced by Carbon Contamination in Low-Temperature Epitaxial Silicon Films Grown with Monosilane

    NASA Astrophysics Data System (ADS)

    Sato, Shin'ya; Mizushima, Ichiro; Miyano, Kiyotaka; Sato, Tsutomu; Nakamura, Shin'ichi; Tsunashima, Yoshitaka; Arikado, Tsunetoshi; Uchitomi, Naotaka

    2005-03-01

    The structures of the defects induced by carbon contamination in epitaxial silicon films grown with monosilane (SiH4) on silicon substrates were investigated. A new formation mechanism of defects associated with carbon in silicon epitaxial growth processes is proposed. The carbon contaminants were introduced prior to the growth by chemical vapor deposition (CVD), where the growth chamber was intentionally contaminated with organic materials. The carbon contaminant concentration was changed by adjusting the annealing conditions at temperatures ranging from 900°C to 1100°C. Silicon epitaxial films were grown by CVD at a temperature of 700°C. In this experiment, we found that pits were formed as dominant surface defects under the condition of a relatively low carbon concentration of less than 4.5× 1013 cm-2, while mound defects were formed at a carbon concentration of more than 4.5× 1013 cm-2. These defects can be explained by the formation of silicon carbide (SiC) islands resulting from the carbon contamination.

  13. The frequency-dependent AC photoresistance behavior of ZnO thin films grown on different sapphire substrates.

    PubMed

    Cholula-Díaz, Jorge L; Barzola-Quiquia, José; Videa, Marcelo; Yin, Chunhai; Esquinazi, Pablo

    2017-09-13

    Zinc oxide (ZnO) thin films were grown by pulsed layer deposition under an N2 atmosphere at low pressures on a- and r-plane sapphire substrates. Structural studies using X-ray diffraction confirmed that all films had a wurtzite phase. ZnO thin films on a- and r-plane sapphire have grown with orientations along the [0002] and [112[combining macron]0] directions, respectively. Room temperature photoluminescence measurements indicate that the presence of native point defects (interstitial zinc, oxygen vacancies, oxygen antisites and zinc vacancies) is more preponderant for ZnO thin films grown on the r-plane sapphire substrate than the sample grown on the a-plane sapphire substrate. Room temperature impedance spectroscopy measurements were performed in an alternating current frequency range from 40 to 10(5) Hz in the dark and under normal light. An unusual positive photoresistance effect is observed at frequencies above 100 kHz, which we suggest to be due to intrinsic defects present in the ZnO thin films. Furthermore, an analysis of the optical time response revealed that the film grown on the r-plane sapphire substrate responds faster (characteristic relaxation times for τ1, τ2 and τ3 of 0.05, 0.26 and 6.00 min, respectively) than the film grown on the a-plane sapphire substrate (characteristic relaxation times for τ1, τ2 and τ3 of 0.10, 0.73 and 4.02 min, respectively).

  14. Growth mechanism of single-crystalline NiO thin films grown by metal organic chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Roffi, Teuku Muhammad; Nozaki, Shinji; Uchida, Kazuo

    2016-10-01

    Nickel oxide (NiO) thin films were grown by atmospheric-pressure metal organic chemical vapor deposition (APMOCVD). Growth was carried out using various growth parameters, including the growth temperature, the input precursor (O2/Ni) ratio, and the type of substrate material. Effects of the growth parameters on the structural and electrical properties of the films were investigated. X-ray diffraction analysis revealed that the crystal structure and quality were strongly affected by the growth temperature and the type of substrate material. At an optimized growth temperature, single-crystalline NiO films were grown on MgO(100) and MgO(111) substrates in a cube-on-cube orientation relationship, while on an Al2O3(001) substrate, the film was grown in the NiO[111] direction. The use of MgO substrates successfully suppressed the formation of twin defects, which have been frequently reported in the growth of NiO. The difference in the formation of the twin defects on MgO and Al2O3 substrates was discussed. It was observed that the resistivity dependence on crystal quality was affected by the choice of substrate material. The effects of the precursor ratio on the transmittance and resistivity of the films were also investigated. Improved transparency in the visible wavelength region and higher conductivity were found in films grown with higher O2/Ni ratios.

  15. Electric control of magnon frequencies and magnetic moment of bismuth ferrite thin films at room temperature

    PubMed Central

    Kumar, Ashok; Scott, J. F.; Katiyar, R. S.

    2011-01-01

    Here, we report the tuning of room-temperature magnon frequencies from 473 GHz to 402 GHz (14%) and magnetic moment from 4 to 18 emu∕cm3 at 100 Oe under the application of external electric fields (E) across interdigital electrodes in BiFeO3 (BFO) thin films. A decrease in magnon frequencies and increase in phonon frequencies were observed with Magnon and phonon Raman intensities are asymmetric with polarity, decreasing with positive E (+E) and increasing with negative E (−E) where polarity is with respect to in-plane polarization P. The magnetoelectric coupling (α) is proved to be linear and a rather isotropic α = 8.5 × 10−12 sm−1. PMID:21901050

  16. Electric control of magnon frequencies and magnetic moment of bismuth ferrite thin films at room temperature.

    PubMed

    Kumar, Ashok; Scott, J F; Katiyar, R S

    2011-08-08

    Here, we report the tuning of room-temperature magnon frequencies from 473 GHz to 402 GHz (14%) and magnetic moment from 4 to 18 emu∕cm(3) at 100 Oe under the application of external electric fields (E) across interdigital electrodes in BiFeO(3) (BFO) thin films. A decrease in magnon frequencies and increase in phonon frequencies were observed with Magnon and phonon Raman intensities are asymmetric with polarity, decreasing with positive E (+E) and increasing with negative E (-E) where polarity is with respect to in-plane polarization P. The magnetoelectric coupling (α) is proved to be linear and a rather isotropic α = 8.5 × 10(-12) sm(-1).

  17. Structural and optical characterization of ZrO2 thin films grown on silicon and quartz substrates

    NASA Astrophysics Data System (ADS)

    Hojabri, Alireza

    2016-09-01

    Zirconium oxide thin films were grown successfully by thermal annealing of zirconium thin films deposited on quartz and silicon substrates by direct current magnetron sputtering technique. The structural and optical properties in relation to thermal annealing times were investigated. The X-ray diffraction patterns revealed that structure of films changes from amorphous to crystalline by increase of annealing times in range 60-240 min. The composition of films was determined by Rutherford back scattering spectroscopy. Atomic force microscopy results exhibited that surface morphology and roughness of films depend on the annealing time. The refractive index of the films was calculated using Swanepoel's method. The optical band gap energy of annealed films decreased from 5.50 to 5.34 eV with increasing thermal annealing time.

  18. The structural state of epitaxial GaP films of different polarities grown on misoriented Si(001) substrates

    NASA Astrophysics Data System (ADS)

    Loshkarev, I. D.; Vasilenko, A. P.; Trukhanov, E. M.; Kolesnikov, A. V.; Putyato, M. A.; Esin, M. Yu.; Petrushkov, M. O.

    2017-02-01

    The structure of GaP films grown by molecular-beam epitaxy on vicinal Si(1113) substrates has been studied by X-ray diffraction. It is established that the crystalline lattice of a pseudomorphic film rotates about the <110> axis toward increasing deviation from the singular orientation, while the subsequent relaxation leads to rotation in the opposite direction. This is valid for the films of both (001) and (001¯) polarities. Differences between the surface morphologies of relaxed and pseudomorphic GaP films are revealed.

  19. Low-temperature-grown continuous graphene films from benzene by chemical vapor deposition at ambient pressure

    NASA Astrophysics Data System (ADS)

    Jang, Jisu; Son, Myungwoo; Chung, Sunki; Kim, Kihyeun; Cho, Chunhum; Lee, Byoung Hun; Ham, Moon-Ho

    2015-12-01

    There is significant interest in synthesizing large-area graphene films at low temperatures by chemical vapor deposition (CVD) for nanoelectronic and flexible device applications. However, to date, low-temperature CVD methods have suffered from lower surface coverage because micro-sized graphene flakes are produced. Here, we demonstrate a modified CVD technique for the production of large-area, continuous monolayer graphene films from benzene on Cu at 100-300 °C at ambient pressure. In this method, we extended the graphene growth step in the absence of residual oxidizing species by introducing pumping and purging cycles prior to growth. This led to continuous monolayer graphene films with full surface coverage and excellent quality, which were comparable to those achieved with high-temperature CVD; for example, the surface coverage, transmittance, and carrier mobilities of the graphene grown at 300 °C were 100%, 97.6%, and 1,900-2,500 cm2 V-1 s-1, respectively. In addition, the growth temperature was substantially reduced to as low as 100 °C, which is the lowest temperature reported to date for pristine graphene produced by CVD. Our modified CVD method is expected to allow the direct growth of graphene in device manufacturing processes for practical applications while keeping underlying devices intact.

  20. Growth Parameters for Thin Film InBi Grown by Molecular Beam Epitaxy

    NASA Astrophysics Data System (ADS)

    Keen, B.; Makin, R.; Stampe, P. A.; Kennedy, R. J.; Sallis, S.; Piper, L. J.; McCombe, B.; Durbin, S. M.

    2014-04-01

    The alloying of bismuth with III-V semiconductors, in particular GaAs and InAs thin films grown by molecular beam epitaxy (MBE), has attracted considerable interest due to the accompanying changes in band structure and lattice constant. Specifically, bismuth incorporation in these compounds results in both a reduction in band gap (through shifting of the valence band) and an increase in the lattice constant of the alloy. To fully understand the composition of these alloys, a better understanding of the binary endpoints is needed. At present, a limited amount of literature exists on the III-Bi family of materials, most of which is theoretical work based on density functional theory calculations. The only III-Bi material known to exist (in bulk crystal form) is InBi, but its electrical properties have not been sufficiently studied and, to date, the material has not been fabricated as a thin film. We have successfully deposited crystalline InBi on (100) GaAs substrates using MBE. Wetting of the substrate is poor, and regions of varying composition exist across the substrate. To obtain InBi, the growth temperature had to be below 100 °C. It was found that film crystallinity improved with reduced Bi flux, into an In-rich regime. Additionally, attempts were made to grow AlBi and GaBi.

  1. Frictional Properties of UV illuminated ZnO Thin Films Grown by Pulsed Laser Deposition

    NASA Astrophysics Data System (ADS)

    Chiu, Hsiang-Chih; Chang, Huan-Pu; Lo, Fang-Yu; Yeh, Yu-Ting; Department of Physics, National Taiwan Normal University Collaboration

    Zinc Oxide (ZnO) nanostructures have potential applications in nano-electro-mechanical systems (NEMS) due to their unique physical properties. ZnO is also an excellent lubricant and hence a promising candidate for protective coatings in NEMS. By means of atomic force microscopy (AFM), we have investigated the frictional properties of ZnO thin films prepared by pulsed laser deposition technique. In addition, UV illumination is used to convert the surface wettability of ZnO thin films from being more hydrophobic to superhydrophilic via the photo-catalyst effect. We found that the frictional properties of the UV illuminated, superhydrophilic ZnO surface are strongly dependent on the environment humidity. While for hydrophobic ZnO, no such dependence is found. The observed frictional behaviors can be explained by the interplay between the surface roughness, environmental humidity and the presence of nanoscale capillary condensation forming between surface asperities at the tip-ZnO contact. Our results might find applications in future ZnO related NEMS. Frictional Properties of UV illuminated ZnO Thin Films Grown by Pulsed Laser Deposition.

  2. Low-temperature-grown continuous graphene films from benzene by chemical vapor deposition at ambient pressure

    PubMed Central

    Jang, Jisu; Son, Myungwoo; Chung, Sunki; Kim, Kihyeun; Cho, Chunhum; Lee, Byoung Hun; Ham, Moon-Ho

    2015-01-01

    There is significant interest in synthesizing large-area graphene films at low temperatures by chemical vapor deposition (CVD) for nanoelectronic and flexible device applications. However, to date, low-temperature CVD methods have suffered from lower surface coverage because micro-sized graphene flakes are produced. Here, we demonstrate a modified CVD technique for the production of large-area, continuous monolayer graphene films from benzene on Cu at 100–300 °C at ambient pressure. In this method, we extended the graphene growth step in the absence of residual oxidizing species by introducing pumping and purging cycles prior to growth. This led to continuous monolayer graphene films with full surface coverage and excellent quality, which were comparable to those achieved with high-temperature CVD; for example, the surface coverage, transmittance, and carrier mobilities of the graphene grown at 300 °C were 100%, 97.6%, and 1,900–2,500 cm2 V−1 s−1, respectively. In addition, the growth temperature was substantially reduced to as low as 100 °C, which is the lowest temperature reported to date for pristine graphene produced by CVD. Our modified CVD method is expected to allow the direct growth of graphene in device manufacturing processes for practical applications while keeping underlying devices intact. PMID:26658923

  3. Continuous and nanostructured TiO2 films grown by dc sputtering magnetron.

    PubMed

    Sánchez, O; Vergara, L; Font, A Climent; de Melo, O; Sanz, R; Hernández-Vélez, M

    2012-12-01

    The growth of Anatase nanostructured films using dc reactive magnetron sputtering and post-annealing treatment is reported. TiO2 has been deposited on Porous Anodic Alumina Films used as templates which were previously grown in phosphoric acid solution and etched to modify their pore diameters. This synthesis via results in the formation of vertically aligned and spatially ordered TiO2 nanostructures replicating the underlying template. Previously, the growth optimization of TiO2 thin films deposited by dc magnetron sputtering on flat silicon substrates was done. The crystalline structure and Ti in-depth concentration profile were determined by grazing incidence X-ray diffraction and Rutherford backscattering spectrometry, respectively. The surface morphology of the samples was explored by mean of a Field Emission Gun scanning electron microscope. Optical properties of the nanostructured samples were studied by using the reflectance spectra received in the UV-visible range. In these spectra different band gap values and complex light absorption features were observed.

  4. Reproducibility and off-stoichiometry issues in nickelate thin films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Preziosi, Daniele; Sander, Anke; Barthélémy, Agnès; Bibes, Manuel

    2017-01-01

    Rare-earth nickelates are strongly correlated oxides displaying a metal-to-insulator transition at a temperature tunable by the rare-earth ionic radius. In PrNiO3 and NdNiO3, the transition is very sharp and shows an hysteretic behavior akin to a first-order transition. Both the temperature at which the transition occurs and the associated resistivity change are extremely sensitive to doping and therefore to off-stoichiometry issues that may arise during thin film growth. Here we report that strong deviations in the transport properties of NdNiO3 films can arise in films grown consecutively under nominally identical conditions by pulsed laser deposition; some samples show a well-developed transition with a resistivity change of up to five orders of magnitude while others are metallic down to low temperatures. Through a detailed analysis of in-situ X-ray photoelectron spectroscopy data, we relate this behavior to large levels of cationic off-stoichoimetry that also translate in changes in the Ni valence and bandwidth. Finally, we demonstrate that this lack of reproducibility can be remarkably alleviated by using single-phase NdNiO3 targets.

  5. A kinetic model for stress generation in thin films grown from energetic vapor fluxes

    SciTech Connect

    Chason, E.; Karlson, M.; Colin, J. J.; Abadias, G.; Magnfält, D.; Sarakinos, K.

    2016-04-14

    We have developed a kinetic model for residual stress generation in thin films grown from energetic vapor fluxes, encountered, e.g., during sputter deposition. The new analytical model considers sub-surface point defects created by atomic peening, along with processes treated in already existing stress models for non-energetic deposition, i.e., thermally activated diffusion processes at the surface and the grain boundary. According to the new model, ballistically induced sub-surface defects can get incorporated as excess atoms at the grain boundary, remain trapped in the bulk, or annihilate at the free surface, resulting in a complex dependence of the steady-state stress on the grain size, the growth rate, as well as the energetics of the incoming particle flux. We compare calculations from the model with in situ stress measurements performed on a series of Mo films sputter-deposited at different conditions and having different grain sizes. The model is able to reproduce the observed increase of compressive stress with increasing growth rate, behavior that is the opposite of what is typically seen under non-energetic growth conditions. On a grander scale, this study is a step towards obtaining a comprehensive understanding of stress generation and evolution in vapor deposited polycrystalline thin films.

  6. Control of native acceptor density in epitaxial Cu2O thin films grown by electrochemical deposition

    NASA Astrophysics Data System (ADS)

    Ashida, Atsushi; Sato, Shunsuke; Yoshimura, Takeshi; Fujimura, Norifumi

    2017-06-01

    Controlling the native carrier is essential for using Cu2O in devices such as solar cells. The origin of the native p-type carrier in Cu2O is thought to be copper vacancies (VCu). In this work, epitaxially grown Cu2O thin films were prepared by electrochemical deposition at a low temperature of 45 °C on a Pt (111) cathodic electrode. The sources of Cu and O for Cu2O were Cu2+ and OH- in the electrolyte and the ion concentrations were changed to control the stoichiometry of deposition and the density of VCu. The density of ionized acceptors (NA+) in the Cu2O films was evaluated by the C-V properties measured with Schottky electrodes. NA+ did not depend on [Cu2+], whereas NA+ increased with increasing [OH-] when [OH-] was larger than 10-3 mol/L (electrolyte pH >11) with [Cu2+] fixed at 10-1 mol/L. The ion concentration dependence of NA+ and the dependence of the total cathodic current density revealed that the generation of VCu was affected by a complex combination of the ion concentrations and film growth rate.

  7. Optical investigations of Be doped ZnO films grown by molecular beam epitaxy

    SciTech Connect

    Chen, Mingming; Zhu, Yuan; Chen, Anqi; Shen, Zhen; Tang, Zikang

    2016-06-15

    Highlights: • The optical properties of Be doped ZnO films were investigated. • Low temperature photoluminescence spectrum was dominated by D°X and DAP emissions. • Shallow acceptor state with ionization energy of 116 meV was found in ZnO:Be films. • It is suggested that the incorporated Be atom might favor formation of Zn vacancies defects. • This work demonstrates that N doping BeZnO might be suitable for fabricating reliable p-type ZnO materials. - Abstract: In this article, the optical properties of ZnO:Be films grown by plasma-assisted molecular beam epitaxy were investigated by the excitation density-dependent and temperature-dependent photoluminescence measurements. The low temperature photoluminescence spectra showed a dominant excitons bound to neutral donors (D°X) emission centered at 3.3540 eV and strong donor-acceptor pair (DAP) transitions at 3.3000 eV. In addition, it showed that the intensity ratio of the DAP and D°X peaks changed with background electron concentration. Furthermore, a shallow acceptor state with ionization energy of 116 meV was found and attributed to Zn vacancy. The present study further suggests that Be and N codoping ZnO might be suitable for fabricating reliable p-type ZnO materials.

  8. STM study of the Ga thin films grown on Si(111) surface

    NASA Astrophysics Data System (ADS)

    Tao, Min-Long; Tu, Yu-Bing; Sun, Kai; Ye, Juan; Hao, Shao-Jie; Xiao, Hua-Fang; Wang, Ya-Li; Xie, Zheng-Bo; Wang, Jun-Zhong

    2017-09-01

    Structural evolution of Ga thin films grown on the Si(111)-√{ 3 } × √{ 3 } -Ga template have been investigated with a low-temperature scanning tunneling microscopy (STM). The first Ga layer exhibits a stripe structure along the base vectors of Si(111) lattices. Individual Ga dimers have been directly visualized from the high-resolution STM images of the first Ga layer. The second Ga layer reveals a pseudo 1×1 structure with respect to the Si(111). A new 5×5 phase has been found in the second Ga layer when annealing the sample to 120 ℃. Further annealing to 150 ℃ leads to the formation of 6.3×6.3 phase, which is more stable than the 5×5 phase. The existences of a variety of superstructures of Ga films demonstrates the delicate balance between the interactions of Si(111)-Ga and Ga-Ga. These results shed important light on the epitaxial growth mechanism of Ga films on semiconductor surfaces.

  9. Magnetic and structural properties of Co2FeAl thin films grown on Si substrate

    NASA Astrophysics Data System (ADS)

    Belmeguenai, Mohamed; Tuzcuoglu, Hanife; Gabor, Mihai; Petrisor, Traian; Tiusan, Coriolan; Berling, Dominique; Zighem, Fatih; Mourad Chérif, Salim

    2015-01-01

    The correlation between magnetic and structural properties of Co2FeAl (CFA) thin films of different thicknesses (10 nmgrown at room temperature on MgO-buffered Si/SiO2 substrates and annealed at 600 °C has been studied. x-ray diffraction (XRD) measurements revealed an (011) out-of-plane textured growth of the films. The deduced lattice parameter increases with the film thickness. Moreover, pole figures showed no in-plane preferential growth orientation. The magneto-optical Kerr effect hysteresis loops showed the presence of a weak in-plane uniaxial anisotropy with a random easy axis direction. The coercive field, measured with the applied field along the easy axis direction, and the uniaxial anisotropy field increase linearly with the inverse of the CFA thickness. The microstrip line ferromagnetic resonance measurements for in-plane and perpendicular applied magnetic fields revealed that the effective magnetization and the uniaxial in-plane anisotropy field follow a linear variation versus the inverse CFA thickness. This allows deriving a perpendicular surface anisotropy coefficient of -1.86 erg/cm2.

  10. Electrical Conduction Mechanism in Chemical Vapour Deposition Grown Multi-Wall Carbon Nanotubes Film.

    PubMed

    Al-Hazmi, F S

    2015-07-01

    Multi-walled carbon nanotubes are interesting systems where different aspects of conduction are observed, mostly due to their low dimensionalities and small dimensions. Electrical conduction mechanism in multi wall carbon nanotubes film is studied. The studied multi-walled nanotubes are grown by a low pressure chemical vapour deposition system. To understand the conduction mechanism in these nanotubes, temperature dependence of conductivity of the multi wall nanotubes film over a temperature range of (400-200 K) is studied. On the basis of the results, one may suggest the thermally activated conduction mechanism for the temperature range (400-300 K). The low temperature data is fitted with the hopping conduction for the transport of charge carriers in the temperature range of 300-200 K. This hopping conduction mechanism is characterized by variable range hopping (VRH), which shows complete agreement with the Mott's type of VRH mechanism. Applying this model, a number of Mott's parameters such as density of states, hopping distance, hopping energy are calculated. The calculated values of all the studied parameters matches well the reported results on other multi-wall nanotubes film.

  11. Ultrafast carrier dynamics and the role of grain boundaries in polycrystalline silicon thin films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Titova, Lyubov V.; Cocker, Tyler L.; Xu, Sijia; Baribeau, Jean-Marc; Wu, Xiaohua; Lockwood, David J.; Hegmann, Frank A.

    2016-10-01

    We have used time-resolved terahertz spectroscopy to study microscopic photoconductivity and ultrafast photoexcited carrier dynamics in thin, pure, non-hydrogenated silicon films grown by molecular beam epitaxy on quartz substrates at temperatures ranging from 335 °C to 572 °C. By controlling the growth temperature, thin silicon films ranging from completely amorphous to polycrystalline with minimal amorphous phase can be achieved. Film morphology, in turn, determines its photoconductive properties: in the amorphous phase, carriers are trapped in bandtail states on sub-picosecond time scales, while the carriers excited in crystalline grains remain free for tens of picoseconds. We also find that in polycrystalline silicon the photoexcited carrier mobility is carrier-density-dependent, with higher carrier densities mitigating the effects of grain boundaries on inter-grain transport. In a film grown at the highest temperature of 572 °C, the morphology changes along the growth direction from polycrystalline with needles of single crystals in the bulk of the film to small crystallites interspersed with amorphous silicon at the top of the film. Depth profiling using different excitation wavelengths shows corresponding differences in the photoconductivity: the photoexcited carrier lifetime and mobility are higher in the first 100-150 nm from the substrate, suggesting that thinner, low-temperature grown polycrystalline silicon films are preferable for photovoltaic applications.

  12. Structural Properties Characterized by the Film Thickness and Annealing Temperature for La2O3 Films Grown by Atomic Layer Deposition.

    PubMed

    Wang, Xing; Liu, Hongxia; Zhao, Lu; Fei, Chenxi; Feng, Xingyao; Chen, Shupeng; Wang, Yongte

    2017-12-01

    La2O3 films were grown on Si substrates by atomic layer deposition technique with different thickness. Crystallization characteristics of the La2O3 films were analyzed by grazing incidence X-ray diffraction after post-deposition rapid thermal annealing treatments at several annealing temperatures. It was found that the crystallization behaviors of the La2O3 films are affected by the film thickness and annealing temperatures as a relationship with the diffusion of Si substrate. Compared with the amorphous La2O3 films, the crystallized films were observed to be more unstable due to the hygroscopicity of La2O3. Besides, the impacts of crystallization characteristics on the bandgap and refractive index of the La2O3 films were also investigated by X-ray photoelectron spectroscopy and spectroscopic ellipsometry, respectively.

  13. Effects of sapphire annealing on the structural properties of AIN thin films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Liu, Yun; Zhang, Jia

    2010-03-01

    The effects of sapphire annealing on high-quality AlN growth by molecular beam epitaxy have been studied. AlN thin films grown on annealed sapphire (1200 °C, 12 h) were hole-free. The full width at half maximum of the (0 0 0 2) and (1 0 1bar 5)ω-rocking curves for 260 nm-thick AlN thin films grown on annealed sapphires were 200 and 900 arcsec, respectively. The substantial improvement of AlN quality is ascribed to reduction of dislocation density by sapphire annealing.

  14. Nano-Crystalline Diamond Films with Pineapple-Like Morphology Grown by the DC Arcjet vapor Deposition Method

    NASA Astrophysics Data System (ADS)

    Li, Bin; Zhang, Qin-Jian; Shi, Yan-Chao; Li, Jia-Jun; Li, Hong; Lu, Fan-Xiu; Chen, Guang-Chao

    2014-08-01

    A nano-crystlline diamond film is grown by the dc arcjet chemical vapor deposition method. The film is characterized by scanning electron microscopy, high-resolution transmission electron microscopy (HRTEM), x-ray diffraction (XRD) and Raman spectra, respectively. The nanocrystalline grains are averagely with 80 nm in the size measured by XRD, and further proven by Raman and HRTEM. The observed novel morphology of the growth surface, pineapple-like morphology, is constructed by cubo-octahedral growth zones with a smooth faceted top surface and coarse side surfaces. The as-grown film possesses (100) dominant surface containing a little amorphous sp2 component, which is far different from the nano-crystalline film with the usual cauliflower-like morphology.

  15. Heavily B-Doped Epitaxial Si Films Grown by Photochemical Vapor Deposition at Very Low Temperature ( <200° C)

    NASA Astrophysics Data System (ADS)

    Oshima, Takayuki; Abe, Katsuya; Yamada, Akira; Konagai, Makoto

    1995-11-01

    Heavily B-doped epitaxial Si films were grown by photochemical vapor deposition (photo-CVD) using a gas mixture of SiH4, H2, SiH2Cl2 and B2H6 in the substrate temperature range of 160-210° C. The electrical and optical properties of the obtained films were evaluated. The most striking result was that B atoms in the as-grown films were almost 100% neutralized even though the hole concentration was increased to 1.3×1020 cm-3 by annealing. It was found that the hole concentration increased as a stretched-exponential function of the annealing time, and an infrared absorption band at 2210 cm-1, which is regarded as a B-related band, appeared as the B-doping quantity was increased. The neutralization of B is considered to be related to H atoms in the films.

  16. Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales

    SciTech Connect

    Koshelev, I.; Paulikas, A.P.; Veal, B.W.

    1999-02-01

    Refracted X-ray fluorescence (RXF) is a relatively new technique developed for studying properties of thin films. In this paper, formalism for analysis of RXF measurements is derived from a new perspective. The technique is applied to the study of thermally grown oxide scales; model predictions are tested. The evolution of chromia scales on Fe-25Cr-20Ni-0.3Y alloys and some aspects of alumina scales grown on {beta}-NiAl are investigated. Some of the data were taken in situ, during the oxidation process. Deposited films of Fe-25Cr-20Ni-0.3Y alloys of varying thickness and the oxidation of those films were also studied. The technique is generally applicable to thin-film studies. It provides scale-composition and depth-profile information, scale thicknesses and growth rates, and information about transient-phase evolution.

  17. Microstructural Evolution and Domain Structures of Flux-grown Ferroelectric Thin Films

    NASA Astrophysics Data System (ADS)

    Burch, Matthew James

    Barium titanate is one of the most commonly utilized dielectric materials for commercial applications. As devices continue to scale smaller, it is necessary to find processing routes that allow for the integration of high-permittivity barium titanate into the thin film geometry. In the bulk, high permittivity barium titanate can be produced at high processing temperatures (>1250°C). This is several hundred degrees higher than many low temperature substrates are able to withstand, which makes integration of high-permittivity barium titanate onto these substrates a challenge.One method to lower the processing temperature and maintain bulk-like permittivity of barium titanate thin films is through the addition of a liquid forming flux. The fluxing agent increases the kinetics of the system while encouraging densification. This increase in kinetics results in large-grained, dense samples, with high dielectric properties at relatively low processing temperatures. In this dissertation, the underlying mechanisms of how the flux system actually impacts the microstructural evolution of physically vapor deposited barium titanate thin films on sapphire substrates is explored. The flux-system utilized is the barium-borate system (BaOB2O3). It will be shown that the flux system results in large-grained, dense barium titanate thin films grown on sapphire. However, the evolution of the microstructure depends on a complex interaction between the liquid forming flux, a reaction between the sapphire substrate and barium titanate, the resulting reactionary phase of BaAl2O4, and {111}-barium titanate twins. (Abstract shortened by ProQuest.).

  18. Optical properties of metal oxynitride thin films grown with atmospheric plasma deposition

    NASA Astrophysics Data System (ADS)

    Hovish, Michael Q.; Dauskardt, Reinhold H.

    2016-10-01

    Thin films of tantalum oxynitride (TaO x N y ) and titanium oxynitride (TiO x N y ) are deposited using atmospheric plasma deposition and a suite of optical properties are reported. Tantalum and titanium ethoxide are introduced into the afterglow of a radio-frequency capacitively coupled plasma, facilitating the growth of oxynitride films on silicon and polycarbonate at temperatures below 180 °C. The plasma power and nitrogen flow within the plasma are varied between 60 and 120 W and between 0.1 and 0.3 LPM respectively. We use spectroscopic ellipsometry to show that the optical properties of the metal oxynitride films grown in this study are comparable to those synthesized with sol-gel methods. Measurement of both the extinction coefficient and the transmission on polycarbonate substrates indicates good transparency in the visible wavelengths of light. Additionally, the refractive index increases when increasing the number of reactive nitrogen species within the discharge. We use x-ray photoelectron spectroscopy to correlate the higher indexes observed at large secondary gas flows to the presence of metal oxynitride bonding. Single layer anti-reflection coatings are deposited on silicon, with a five-fold and seven-fold reduction in reflection for TaO x N y and TiO x N y coatings, respectively. In total, we have found that the modulation of nitrogen concentration within the plasma discharge results in good control over optical constants. In addition, we observe similarities between films deposited with atmospheric plasma and those reported for sol-gel, indicating an alternative processing route where solution chemistries are currently applied.

  19. Electrical and optical properties of VO2 thin films grown on various sapphire substrates by using RF sputtering deposition

    NASA Astrophysics Data System (ADS)

    Jung, Dae Ho; So, Hyeon Seob; Ko, Kun Hee; Park, Jun Woo; Lee, Hosun; Nguyen, Trang Thi Thu; Yoon, Seokhyun

    2016-12-01

    VO2 thin films were grown on a-, c-, m-, and r-plane sapphire and SiO2/Si substrates under identical conditions by using RF sputtering deposition from a VO2 target. The structural and the morphological properties of all VO2 films were investigated. The grain sizes of the VO2 films varied between 268 nm and 355 nm depending on the substrate's orientation. The electrical and the optical properties of all VO2 thin films were examined in detail. The metal-insulator transition temperature (TMI) varied with the substrate's orientation. The (200)/(bar 211 )-oriented VO2 films on the a-plane sapphire showed the lowest TMI of about 329.3 K (56.3 °C) while the (020)/(002)-VO2 films on the c-plane sapphire displayed the highest TMI of about 339.6 K (66.6 °C). The VO2 films showed reversible changes in the resistivity as large as 1.19 × 105 and a hysteresis of 2 K upon traversing the transition temperature. The variations observed in the TMI with respect to the substrate's orientation were due to changes in the lattice strain and the grain size distribution. Raman spectroscopy showed that metal (rutile) - insulator (monoclinic) transitions occurred via the M2 phase for VO2 films on the c-plane substrate rather than the direct M1 to rutile transition. The shifts in the phonon frequencies of the VO2 film grown on various sapphire substrates were explained in terms of the strain along the V-V atomic bond direction (cR). Our work shows a possible correlation between the transition parameters ( e.g., TMI, sharpness, and hysteresis width) and the width ( σ) of the grain size distribution. It also shows a possible correlation between the TMI and the resistivities at the insulating and the metallic phases for VO2 films grown on various sapphire substrates.

  20. 90{degree} Magnetization Switching in Thin Fe Films Grown on Stepped Cr(001)

    SciTech Connect

    Escorcia-Aparicio, E.J.; Choi, H.J.; Ling, W.L.; Kawakami, R.K.; Qiu, Z.Q.

    1998-09-01

    The ferromagnetic/antiferromagnetic interfacial interaction was investigated in thin Fe films grown on stepped Cr(001) with the steps parallel to the [100] direction. Above the N{acute e}el temperature of the Cr, the atomic steps induce a uniaxial magnetic anisotropy with the easy axis parallel to the step edges. Below the N{acute e}el temperature, the Fe-Cr interfacial interaction favors the Fe magnetization perpendicular to the step edges. The competition between the Fe-Cr interaction and the step-induced magnetic anisotropy results in an in-plane 90{degree} magnetization switching from perpendicular to the step edges at low step-density to parallel to the step edges at high step density. {copyright} {ital 1998} {ital The American Physical Society }

  1. Structural and optical characterizations of InPBi thin films grown by molecular beam epitaxy.

    PubMed

    Gu, Yi; Wang, Kai; Zhou, Haifei; Li, Yaoyao; Cao, Chunfang; Zhang, Liyao; Zhang, Yonggang; Gong, Qian; Wang, Shumin

    2014-01-13

    InPBi thin films have been grown on InP by gas source molecular beam epitaxy. A maximum Bi composition of 2.4% is determined by Rutherford backscattering spectrometry. X-ray diffraction measurements show good structural quality for Bi composition up to 1.4% and a partially relaxed structure for higher Bi contents. The bandgap was measured by optical absorption, and the bandgap reduction caused by the Bi incorporation was estimated to be about 56 meV/Bi%. Strong and broad photoluminescence signals were observed at room temperature for samples with xBi < 2.4%. The PL peak position varies from 1.4 to 1.9 μm, far below the measured InPBi bandgap.

  2. Electronic and magnetic structure of ultra-thin Ni films grown on W(110)

    NASA Astrophysics Data System (ADS)

    Calloni, A.; Bussetti, G.; Berti, G.; Yivlialin, R.; Camera, A.; Finazzi, M.; Duò, L.; Ciccacci, F.

    2016-12-01

    We studied the electronic structure of thin Ni films grown on a W(110) single crystal, as a function of the Ni thickness, by means of angle-resolved photoemission and inverse photoemission spectroscopy, also with spin resolution. The results are discussed in the light of the different stages characterizing the transition from the pseudomorphic bcc to the fully relaxed fcc phase. A clear spin polarization is detected as soon as a bulk-like electronic structure is observed. In these conditions, we characterized the exchange splitting of the occupied bands at the Γbar and Mbar points of the surface Brillouin zone, providing further experimental support to previous interpretations of photoemission spectra from bulk Ni.

  3. Biomass yield and composition of sweetpotato grown in a nutrient film technique system.

    PubMed

    Almazan, A M; Zhou, X

    1997-01-01

    Sweetpotato cultivar TU-82-155 grown in a nutrient film technique system and separated into foliage, tips, fibrous, string and storage roots at harvest had a total dry biomass of 89.9 g per plant with 38.4% inedible portion. Tips and storage roots, the traditional edible parts, were analyzed for dry matter, protein, fat, ash, minerals (Ca, Fe, K, Mg, Na, Zn), vitamins (carotene, ascorbic acid, thiamin), oxalic and tannic acids, and trypsin and chymotrypsin inhibitors to determine their nutritional quality. Water soluble matter, minerals (Ca, Fe, K, Mg, Na, Zn), cellulose, hemicellulose and lignin concentrations in the edible and inedible parts were obtained to provide information needed for the selection of appropriate bioconversion processes of plant wastes into food or forms suitable for crop production in a controlled biological life support system.

  4. High electron mobility in Ga(In)NAs films grown by molecular beam epitaxy

    SciTech Connect

    Miyashita, Naoya; Ahsan, Nazmul; Monirul Islam, Muhammad; Okada, Yoshitaka; Inagaki, Makoto; Yamaguchi, Masafumi

    2012-11-26

    We report the highest mobility values above 2000 cm{sup 2}/Vs in Si doped GaNAs film grown by molecular beam epitaxy. To understand the feature of the origin which limits the electron mobility in GaNAs, temperature dependences of mobility were measured for high mobility GaNAs and referential low mobility GaInNAs. Temperature dependent mobility for high mobility GaNAs is similar to the GaAs case, while that for low mobility GaInNAs shows large decrease in lower temperature region. The electron mobility of high quality GaNAs can be explained by intrinsic limiting factor of random alloy scattering and extrinsic factor of ionized impurity scattering.

  5. Reversible Change in Electrical and Optical Properties in Epitaxially Grown Al-Doped ZnO Thin Films

    SciTech Connect

    Noh, J. H.; Jung, H. S.; Lee, J. K.; Kim, J. Y; Cho, C. M.; An, J.; Hong, K. S.

    2008-01-01

    Aluminum-doped ZnO (AZO) films were epitaxially grown on sapphire (0001) substrates using pulsed laser deposition. As-deposited AZO films had a low resistivity of 8.01 x 10{sup -4} {Omega} cm. However, after annealing at 450 C in air, the electrical resistivity of the AZO films increased to 1.97 x 10{sup -1} {Omega} cm because of a decrease in the carrier concentration. Subsequent annealing of the air-annealed AZO films in H{sub 2} recovered the electrical conductivity of the AZO films. In addition, the conductivity change was reversible upon repeated air and H{sub 2} annealing. A photoluminescence study showed that oxygen interstitial (O{sub i}) is a critical material parameter allowing for the reversible control of the electrical conducting properties of AZO films.

  6. Synthesis of nanocrystalline Cu2ZnSnS4 thin films grown by the spray-pyrolysis technique

    NASA Astrophysics Data System (ADS)

    Chandel, Tarun; Singh, Joginder; Rajaram, P.

    2015-08-01

    Spray pyrolysis was used to deposit Cu2ZnSnS4 (CZTS) thin films on soda lime glass substrates at 300 °C. Aqueous solutions of copper chloride, zinc chloride, stannous chloride and thiourea were mixed together to form the spray liquid. The sprayed films were annealed under vacuum at 350 °C, 400 °C and 450 °C. Structural and optical characterization was performed on the CZTS films using X-ray diffraction (XRD) and UV-VIS spectrophotometry. XRD results indicate that the films are single phase nanocrystalline CZTS. Optical studies show that the optical gap values are 1.44 eV for the as-grown film and 1.46 eV, 1.48 eV and 1.49 eV for the films annealed at 350 °C, 400 °C and 450 °C, respectively.

  7. Composition and Bonding in Amorphous Carbon Films Grown by Ion Beam Assisted Deposition: Influence of the Assistance Voltage

    SciTech Connect

    Albella, J.M.; Banks, J.C.; Climent-Font, A.; Doyle, B.L.; Gago, R.; Jimenez, I.; Terminello, L.J.

    1998-11-12

    Amorphous carbon films have been grown by evaporation of graphite with concurrent Ar+ ions bombardment assistance. The ion energy has been varied between 0-800 V while keeping a constant ion to carbon atom arrival ratio. Film composition and density were determined by ion scattering techniques (RBS and ERDA), indicating a negligible hydrogen content and a density dependence with the assistance voltage. The bonding structure of the films has been studied by Raman and X-ray Absorption Near-Edge (XANES) spectroscopy. Different qualitative effects have been found depending on the ion energy range. For ion energies below 300 eV, there is a densification of the carbon layer due to the increase in the sp3 content. For ion energies above 300 eV sputtering phenomena dominate over densification, and thinner films are found with increasing assistance voltage until no film is grown over 600 V. The films with the highest SP3 content are grown with intermediate energies between 200-300 V.

  8. Study of overall and local electrochemical responses of oxide films grown on CoCr alloy under biological environments.

    PubMed

    Diaz, I; Martinez-Lerma, J F; Montoya, R; Llorente, I; Escudero, M L; García-Alonso, M C

    2017-06-01

    The interaction of the physiological medium and living tissues with the implant surfaces in biological environments is regulated by biopotentials that induce changes in the chemical composition, structure and thickness of the oxide film. In this work, oxide films grown on CoCr alloys at 0.5 V vs Ag/AgCl and 0.7 V vs Ag/AgCl have been characterized through overall and localized electrochemical techniques in a phosphate buffer solution and 0.3% hyaluronic acid. Nanopores of 10-50nm diameter are homogeneously distributed along the surface in the oxide film formed at 0.7 V vs Ag/AgCl. The distribution of the Constant Phase Element studied by local electrochemical impedance spectroscopy showed a three-dimensional (3D) model on the oxide films grown at 0.5 V vs Ag/AgCl and 0.7 V vs Ag/AgCl. This behaviour is especially noticeable in oxide films grown at 0.7 V vs Ag/AgCl, probably due to surface inhomogeneities, and resistive properties generated by the potentiostatic growth of the oxide film.

  9. Characteristics of Fluorine-doped tin oxide thin films grown by Streaming process for Electrodeless Electrochemical Deposition

    NASA Astrophysics Data System (ADS)

    Yusuf, Gbadebo; Khalilzadeh-Rezaie, Farnood; Cleary, Justin W.; Oladeji, Isaiah O.; Suu, Koukou; Schoenfeld, Winston V.; Peale, Robert E.; Awodugba, Ayodeji O.

    2015-04-01

    This work investigated the characteristics of SnO2: F films grown by Streaming Process for Electrodeless Electrochemical Deposition (SPEED). Stannic chloride (SnCl4) and ammonium fluoride (NH4 F) was dissolved in a mixture of deionized water and organic solvents. The preheated substrate temperature was varied between 450 and 530° C. High quality SnO2: F films were grown at all the substrate temperatures studied. The typical film thickness was 250 nm. XRD shows that the grown films are polycrystalline SnO2 with a tetragonal crystal structure. The average optical transmission of the films was around 93% throughout the wavelength of 400 to 1000 nm. The lowest electrical resistivity achieved was 6 x 10-4 Ω cm. The Hall measurements showed that the film is an n-type semiconductor, with the highest carrier mobility of 8.3 cm2/V.s, and concentration of 1 x 1021 cm-3. The direct band gap was determined to be 4 eV from the transmittance spectrum.

  10. Characterization of Epitaxial Film Silicon Solar Cells Grown on Seeded Display Glass: Preprint

    SciTech Connect

    Young, D. L.; Grover, S.; Teplin, C.; Stradins, P.; LaSalvia, V.; Chuang, T. K.; Couillard, J. G.; Branz, H. M.

    2012-06-01

    We report characterizations of epitaxial film crystal silicon (c-Si) solar cells with open-circuit voltages (Voc) above 560 mV. The 2-um absorber cells are grown by low-temperature (<750 degrees C) hot-wire CVD (HWCVD) on Corning EAGLE XG display glass coated with a layer-transferred (LT) Si seed. The high Voc is a result of low-defect epitaxial Si (epi-Si) growth and effective hydrogen passivation of defects. The quality of HWCVD epitaxial growth on seeded glass substrates depends on the crystallographic quality of the seed and the morphology of the epitaxial growth surface. Heterojunction devices consist of glass/c-Si LT seed/ epi n+ Si:P/epi n- Si:P/intrinsic a-Si:H/p+ a-Si:H/ITO. Similar devices grown on electronically 'dead' n+ wafers have given Voc {approx}630 mV and {approx}8% efficiency with no light trapping features. Here we study the effects of the seed surface polish on epi-Si quality, how hydrogenation influences the device character, and the dominant junction transport physics.

  11. Local structure and magnetic properties of ultrathin Mn films grown on Si(001)

    NASA Astrophysics Data System (ADS)

    Kahwaji, Samer; Monchesky, Theodore; Crozier, Daryl; Gordon, Robert

    2012-02-01

    We report on the structural and magnetic properties of ultrathin Mn layers deposited onto Si(001) by molecular beam epitaxy (MBE) at low temperature. X-ray absorption fine structure (XAFS) studies reveal that the structure of the silicide layer that forms depends on the growth temperature of the capping layer. A capping layer grown at 200 ^oC on 0.35 monolayer (ML) Mn results in a metastable MnSi phase with a B2-like (CsCl) structure, whereas a cap grown at room temperature on 0.5 ML followed by annealing at 200 ^oC produces a lower coordinated MnSi phase with a B20-like structure. Increasing the Mn thickness from 0.5 to 4 monolayers does not trigger a structural transformation but drives the structure closer to MnSi-B20. Using SQUID magnetometry, we show that the sample with B2-like structure has the largest Mn magnetic moment of 0.33μB/Mn at T=2 K, and a Curie temperature TC above 250 K. MnSi-B20 layers showed lower moments and much lower TC's, in-line with those reported for MnSi-B20 thin films.

  12. Epitaxially grown polycrystalline silicon thin-film solar cells on solid-phase crystallised seed layers

    NASA Astrophysics Data System (ADS)

    Li, Wei; Varlamov, Sergey; Xue, Chaowei

    2014-09-01

    This paper presents the fabrication of poly-Si thin film solar cells on glass substrates using seed layer approach. The solid-phase crystallised P-doped seed layer is not only used as the crystalline template for the epitaxial growth but also as the emitter for the solar cell structure. This paper investigates two important factors, surface cleaning and intragrain defects elimination for the seed layer, which can greatly influence the epitaxial grown solar cell performance. Shorter incubation and crystallisation time is observed using a simplified RCA cleaning than the other two wet chemical cleaning methods, indicating a cleaner seed layer surface is achieved. Cross sectional transmission microscope images confirm a crystallographic transferal of information from the simplified RCA cleaned seed layer into the epi-layer. RTA for the SPC seed layer can effectively eliminate the intragrain defects in the seed layer and improve structural quality of both of the seed layer and the epi-layer. Consequently, epitaxial grown poly-Si solar cell on the RTA treated seed layer shows better solar cell efficiency, Voc and Jsc than the one on the seed layer without RTA treatment.

  13. Highly Crystalline CVD-grown Multilayer MoSe2 Thin Film Transistor for Fast Photodetector

    PubMed Central

    Jung, Chulseung; Kim, Seung Min; Moon, Hyunseong; Han, Gyuchull; Kwon, Junyeon; Hong, Young Ki; Omkaram, Inturu; Yoon, Youngki; Kim, Sunkook; Park, Jozeph

    2015-01-01

    Hexagonal molybdenum diselenide (MoSe2) multilayers were grown by chemical vapor deposition (CVD). A relatively high pressure (>760 Torr) was used during the CVD growth to achieve multilayers by creating multiple nuclei based on the two-dimensional crystal growth model. Our CVD-grown multilayer MoSe2 thin-film transistors (TFTs) show p-type-dominant ambipolar behaviors, which are attributed to the formation of Se vacancies generated at the decomposition temperature (650 °C) after the CVD growth for 10 min. Our MoSe2 TFT with a reasonably high field-effect mobility (10 cm2/V · s) exhibits a high photoresponsivity (93.7 A/W) and a fast photoresponse time (τrise ~ 0.4 s) under the illumination of light, which demonstrates the practical feasibility of multilayer MoSe2 TFTs for photodetector applications. PMID:26477744

  14. Ferrite Materials for Advanced Multifunction Microwave Systems Applications

    DTIC Science & Technology

    2006-07-05

    deposited lithium zinc ferrite films ................................................................................. 10 g. High power properties of...as good as the best bulk single crystals, and (9) the request. successful PLD growth of low loss zinc lithium ferrite films. 3. Publications and...093901 (2005).] and Magnetic Materials, 8 - 11 November 2004.] 9 8x10s,. 0o Pulse laser deposited lithium zinc ferrite "E 6 ••xf=10 GHz films, 6x0sEL 0

  15. Microstructural studies of diamond thin films grown by electron cyclotron resonance-assisted chemical vapor deposition

    SciTech Connect

    Gupta, S.; Katiyar, R. S.; Gilbert, D. R.; Singh, R. K.; Morell, G.

    2000-11-15

    A detailed investigation of the correlation among intrinsic stress ({sigma}{sub int}), nonuniform stress ({sigma}{sub nu}), and phonon lifetime (1/{Gamma}) was performed in order to obtain a coherent and comprehensive picture of the microstructure of diamond thin films grown by the electron cyclotron resonance-assisted chemical vapor deposition (ECR-CVD) technique. It was found that the diamond growth taking place by the ECR-CVD is different to that taking place by the microwave CVD and hot-filament CVD. Point and line defects, rather than sp{sup 2} C bonds, were found to be the dominant source of both nonuniform stress and reduced phonon lifetime. The surface relaxation mechanism in these films yields sp{sup 2} C at the expense of strained sp{sup 3} C, resulting in a trade off between diamond yield and crystalline quality. The diamond precursor that spontaneously forms on the unseeded substrates yielded higher quality diamond than planted diamond seeds. The grain boundary relaxation model proposed by Hoffman accounts well for the observed behavior of the intrinsic stress, thus indicating that microstructural restructuration takes place at the grain boundaries when sufficient time and thermal energy are provided.

  16. Comparative study of ITO and FTO thin films grown by spray pyrolysis

    SciTech Connect

    Ait Aouaj, M.; Diaz, R.; Belayachi, A.; Rueda, F.; Abd-Lefdil, M.

    2009-07-01

    Tin doped indium oxide (ITO) and fluorine doped tin oxide (FTO) thin films have been prepared by one step spray pyrolysis. Both film types grown at 400 deg. C present a single phase, ITO has cubic structure and preferred orientation (4 0 0) while FTO exhibits a tetragonal structure. Scanning electron micrographs showed homogeneous surfaces with average grain size around 257 and 190 nm for ITO and FTO respectively. The optical properties have been studied in several ITO and FTO samples by transmittance and reflectance measurements. The transmittance in the visible zone is higher in ITO than in FTO layers with a comparable thickness, while the reflectance in the infrared zone is higher in FTO in comparison with ITO. The best electrical resistivity values, deduced from optical measurements, were 8 x 10{sup -4} and 6 x 10{sup -4} {Omega} cm for ITO (6% of Sn) and FTO (2.5% of F) respectively. The figure of merit reached a maximum value of 2.15 x 10{sup -3} {Omega}{sup -1} for ITO higher than 0.55 x 10{sup -3} {Omega}{sup -1} for FTO.

  17. Neutron Depth Profiling (NDP) of boron thin films in epitaxially grown silicon

    NASA Astrophysics Data System (ADS)

    Chen-Mayer, H. Heather; Lamaze, George P.; Simons, David S.

    2001-03-01

    Neutron Depth Profiling is a technique for the determination of concentration and distribution of certain light elements in the region of about 1 µm below a solid surface. An incident neutron beam activates the nucleus of interest and causes the emission of reaction products in the form of charged particles which carry information of the reaction origin. The eligible elements include boron, lithium, and nitrogen. The most common substrate measured at NIST is silicon. We have studied a calibration sample for the purpose of inter-comparison between NDP and SIMS. The sample is a multilayer consisting of a 1 µm-thick epitaxially grown silicon film with four thin layers of boron about 0.25 micrometers apart. A previous study on the mathematical modeling of the NDP data indicates a discrepancy between the NDP and the SIMS data, either due to the uncertainty of the density of the film or of the stopping power of the alpha particle in silicon. The density has been verified by x-ray reflectivity to be that of the bulk. To understand this discrepancy, we have measured the angular dependence of the charged-particle emission which provides an experimentally determined relation between the energy loss and the depth. The result is compared with the stopping power obtained from TRIM to determine whether the discrepancy can be resolved with a modified stopping power.

  18. Microstructural studies of diamond thin films grown by electron cyclotron resonance-assisted chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Gupta, S.; Katiyar, R. S.; Gilbert, D. R.; Singh, R. K.; Morell, G.

    2000-11-01

    A detailed investigation of the correlation among intrinsic stress (σint), nonuniform stress (σnu), and phonon lifetime (1/Γ) was performed in order to obtain a coherent and comprehensive picture of the microstructure of diamond thin films grown by the electron cyclotron resonance-assisted chemical vapor deposition (ECR-CVD) technique. It was found that the diamond growth taking place by the ECR-CVD is different to that taking place by the microwave CVD and hot-filament CVD. Point and line defects, rather than sp2 C bonds, were found to be the dominant source of both nonuniform stress and reduced phonon lifetime. The surface relaxation mechanism in these films yields sp2 C at the expense of strained sp3 C, resulting in a trade off between diamond yield and crystalline quality. The diamond precursor that spontaneously forms on the unseeded substrates yielded higher quality diamond than planted diamond seeds. The grain boundary relaxation model proposed by Hoffman accounts well for the observed behavior of the intrinsic stress, thus indicating that microstructural restructuration takes place at the grain boundaries when sufficient time and thermal energy are provided.

  19. Phase and disorder investigations in boron nitride thin films grown by PECVD

    SciTech Connect

    Depero, L.E.; Sangaletti, L.; Schaffnit, C.; Rossi, F.; Gibson, P.N.

    1996-12-31

    Based on X-ray diffraction and infrared spectroscopy measurements, BN thin films grown by PECVD on silicon substrates have been studied with the aim of identifying the thin film phase. In a set of samples, while the infrared spectra showed characteristic bands of the hexagonal phase, X-ray diffraction patterns only displayed reflections belonging to the cubic BN phase. Therefore, structural models have been developed to explain the apparent inconsistency between the two sets of experimental data. In particular, static disorder effects--which have been introduced in the model starting from the sp{sup 2} hybridization of the ordered hexagonal phase, as suggested by the infra-red spectroscopy results--allowed a consistent interpretation of the X-ray diffraction patterns. For another set of samples, which also showed a characteristic hexagonal signal in the IR data, the XRD pattern could not be indexed with any of the BN phases. In this case, the presence of molecular and ionic phases, associated with impurities, was considered in structural modeling studies.

  20. Effect of residual stress on the microstructure of GaN epitaxial films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Wang, Haiyan; Wang, Wenliang; Yang, Weijia; Zhu, Yunnong; Lin, Zhiting; Li, Guoqiang

    2016-04-01

    The stress-free GaN epitaxial films have been directly grown by pulsed laser deposition (PLD) at 850 °C, and the effect of different stress on the microstructure of as-grown GaN epitaxial films has been explored in detail. The as-grown stress-free GaN epitaxial films exhibit very smooth surface without any particles and grains, which is confirmed by the smallest surface root-mean-square roughness of 2.3 nm measured by atomic force microscopy. In addition, they also have relatively high crystalline quality, which is proved by the small full-width at half maximum values of GaN(0002) and GaN (10 1 bar 2) X-ray rocking curves as 0.27° and 0.68°, respectively. However, when the growth temperature is lower or higher than 850 °C, internal or thermal stress would be increased in as-grown GaN epitaxial films. To release the larger stress, a great number of dislocations are generated. Many irregular particulates, hexagonal GaN gains and pits are therefore produced on the films surface, and the crystalline quality is greatly reduced consequently. This work has demonstrated the direct growth of stress-free GaN epitaxial films with excellent surface morphology and high crystalline quality by PLD, and presented a comprehensive study on the origins and the effect of stress in GaN layer. It is instructional to achieve high-quality nitride films by PLD, and shows great potential and broad prospect for the further development of high-performance GaN-based devices.

  1. Optical and electrical properties of Titania thin films doped with In3+ and grown by sol-gel process.

    NASA Astrophysics Data System (ADS)

    Rodolfo Palomino Merino, Martín; Lozada Morales, Rosendo; Xoxocotzi Aguilar, Reyna; Díaz Furlong, Alfonso

    2004-03-01

    Using the sol-gel process were prepared Titania (TiO2) thin films formed on glass substrates by dip-coating method. The samples were grown starting from Titanium Isopropoxide and changing the concentration of In3+ ions from Indium Nitrate. The results of the characterization of the samples by UV-VIS spectroscopy , IR , thermopotency and conductivity will be reported.

  2. Spin-dependent Fabry-Pérot interference from a Cu thin film grown on fcc Co(001).

    PubMed

    Wu, Y Z; Schmid, A K; Altman, M S; Jin, X F; Qiu, Z Q

    2005-01-21

    Spin-dependent electron reflection from a Cu thin film grown on Co/Cu(001) was investigated using spin-polarized low-energy electron microscopy (SPLEEM). Fabry-Pe rot type interference was observed and is explained using the phase accumulation model. SPLEEM images of the Cu overlayer reveal magnetic domains in the Co underlayer, with the domain contrast oscillating with electron energy and Cu film thickness. This behavior is attributed to the spin-dependent electron reflectivity at the Cu/Co interface which leads to spin-dependent Fabry-Pe rot electron interference in the Cu film.

  3. Luminescence properties of lanthanide and ytterbium lanthanide titanate thin films grown by atomic layer deposition

    SciTech Connect

    Hansen, Per-Anders Fjellvåg, Helmer; Nilsen, Ola; Finstad, Terje G.

    2016-01-15

    Lanthanide based luminescent materials are highly suitable as down conversion materials in combination with a UV-absorbing host material. The authors have used TiO{sub 2} as the UV-absorbing host material and investigated the energy transfer between TiO{sub 2} and 11 different lanthanide ions, Ln{sup 3+} (Ln = La, Pr, Nd, Sm, Eu, Tb, Dy, Ho, Er, Tm, Yb) in thin films grown by atomic layer deposition. They have also investigated the possibility to improve the overall energy transfer from TiO{sub 2} to Yb{sup 3+} with a second Ln{sup 3+}, in order to enhance down conversion. The films were grown at a substrate temperature of 300 °C, using the Ln(thd){sub 3}/O{sub 3} (thd = 2,2,6,6-tetramethyl-3,5-heptanedione) and TiCl{sub 4}/H{sub 2}O precursor pairs. The focus of the work is to explore the energy transfer from TiO{sub 2} to Ln{sup 3+} ions, and the energy transfer between Ln{sup 3+} and Yb{sup 3+} ions, which could lead to efficient down conversion. The samples have been characterized by x-ray diffraction, x-ray fluorescence, spectroscopic ellipsometry, and photoluminescence. All films were amorphous as deposited, and the samples have been annealed at 600, 800, and 1000 °C in order to investigate the correlation between the crystallinity and luminescence. The lanthanum titanium oxide samples showed a weak and broad emission centered at 540 nm, which was absent in all the other samples, indicating energy transfer from TiO{sub 2} to Ln{sup 3+} in all other lanthanide samples. In the amorphous phase, all samples, apart from La, Tb, and Tm, showed a typical f-f emission when excited by a 325 nm HeCd laser. None of the samples showed any luminescence after annealing at 1000 °C due to the formation of Ln{sub 2}Ti{sub 2}O{sub 7}. Samples containing Nd, Sm, and Eu show a change in emission spectrum when annealed at 800 °C compared to the as-deposited samples, indicating that the smaller lanthanides crystallize in a different manner than the larger

  4. Microstructure of GaN films grown on Si(1 1 1) substrates by metalorganic chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Hu, G. Q.; Kong, X.; Wan, L.; Wang, Y. Q.; Duan, X. F.; Lu, Y.; Liu, X. L.

    2003-09-01

    We report the transmission electron microscopy (TEM) study of the microstructure of wurtzitic GaN films grown on Si(1 1 1) substrates with AlN buffer layers by metalorganic chemical vapor deposition (MOCVD) method. An amorphous layer was formed at the interface between Si and AlN when thick GaN film was grown. We propose the amorphous layer was induced by the large stress at the interface when thick GaN was grown. The In 0.1Ga 0.9N/GaN multiple quantum well (MQW) reduced the dislocation density by obstructing the mixed and screw dislocations from passing through the MQW. But no evident reduction of the edge dislocations by the MQW was observed. It was found that dislocations located at the boundaries of grains slightly in-plane misoriented have screw component. Inversion domain is also observed.

  5. Ferrite microwave electronics Citations from the NTIS data base

    NASA Astrophysics Data System (ADS)

    Reed, W. E.

    1980-07-01

    Research reports on single crystals, thin films, dielectrics, semiconductor devices, integrated circuits, phase shifters, and waveguide components are cited. Studies on the microwave properties of ferrites are included.

  6. Spatial distribution of carrier concentration in un-doped GaN film grown on sapphire

    NASA Astrophysics Data System (ADS)

    Huang, Y.; Chen, X. D.; Beling, C. D.; Fung, S.; Ling, C. C.

    2004-03-01

    The depth and lateral dependent carrier concentration of un-intentionally doped GaN film grown on sapphire substrate have been studied by temperature-dependent Hall effect measurement, confocal micro-Raman spectroscopy and capacitance-voltage (C-V) measurements. The depth-dependent free carrier concentration extracted from the depth-profiled Raman spectra confirms a non-uniform spatial distribution of free carriers in the GaN film with a highly conductive layer of 1 m thickness near the GaN/sapphire boundary. The temperature dependent Hall data have been analyzed using two-layer model to extract the carrier concentration in the GaN bulk film and in the parallel conduction channel adjacent to the GaN/sapphire boundary. The carrier concentrations of the two layers derived from the Raman technique and the Hall measurements agree with each other. The lateral-dependent carrier concentration of the 2-inch GaN epitaxial wafer has also been studied by micro-Raman spectroscopy and C-V measurements. The line-shape fitting of the Raman A1(LO) coupled modes taken from horizontal lateral-different positions on the wafer yielded a rudimentary spatial map of the carrier concentration. These data are compared well with a lateral-dependent carrier concentration map of the wafer revealed by C-V measurements. The study in the article indicates that Raman spectroscopy of the LO phonon-plasmon mode can be used as a nondestructive and reliable, in situ diagnostic for GaN wafer production.

  7. A comparative study of physico-chemical properties of CBD and SILAR grown ZnO thin films

    SciTech Connect

    Jambure, S.B.; Patil, S.J.; Deshpande, A.R.; Lokhande, C.D.

    2014-01-01

    Graphical abstract: Schematic model indicating ZnO nanorods by CBD (Z{sub 1}) and nanograins by SILAR (Z{sub 2}). - Highlights: • Simple methods for the synthesis of ZnO thin films. • Comparative study of physico-chemical properties of ZnO thin films prepared by CBD and SILAR methods. • CBD outperforms SILAR method. - Abstract: In the present work, nanocrystalline zinc oxide (ZnO) thin films have been successfully deposited onto glass substrates by simple and economical chemical bath deposition (CBD) and successive ionic layer adsorption reaction (SILAR) methods. These films were further characterized for their structural, optical, surface morphological and wettability properties. The X-ray diffraction (XRD) patterns for both CBD and SILAR deposited ZnO thin films reveal the highly crystalline hexagonal wurtzite structure. From optical studies, band gaps obtained are 2.9 and 3.0 eV for CBD and SILAR deposited thin films, respectively. The scanning electron microscope (SEM) patterns show growth of well defined randomly oriented nanorods and nanograins on the CBD and SILAR deposited samples, respectively. The resistivity of CBD deposited films (10{sup 2} Ω cm) is lower than that of SILAR deposited films (10{sup 5} Ω cm). Surface wettability studies show hydrophobic nature for both films. From the above results it can be concluded that CBD grown ZnO thin films show better properties as compared to SILAR method.

  8. X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy

    NASA Astrophysics Data System (ADS)

    Oikkonen, Markku

    1988-05-01

    The microstructure of ZnS thin films grown by atomic layer epitaxy (ALE) is investigated using X-ray diffraction and a single-line technique. Crystal structure, preferred orientation, crystallinity, crystallite size, crystallite size distribution, and microstrain are determined. Complex refractive indexes of the films are determined in the wavelength range 400 to 600 nm using spectroscopic ellipsometry. A two-layer model is employed, where the uppermost layer takes into account the surface roughness. Density of ZnS thin films is determined using ellipsometry and He(+)-ion backscattering spectrometry. In the first tens of nanometers of an ALE ZnS thin film the crystallinity and void content strongly depend on the substrate properties. Most of the films were grown on soda glass. It is found that after the bottom layer, at the distances from 50 to 100 nm to 300 to 400 nm from the substrate the crystallinity is good, crystallites are large, the specific orientation is strong, the void content is low, and the optical properties resemble those of bulk ZnS. At distances larger than 300 to 400 nm the surface roughness and the void content in the upper parts of the film increase because of the more and more randomly packed large crystallites. Substrate temperature and source materials affect the growth of all parts of the films.

  9. Morphology and Optical Properties of Zinc Oxide Films Grown on Metal Coated Glass Substrates by Aqueous Chemical Growth

    NASA Astrophysics Data System (ADS)

    Bakar, M. A.; Hamid, M. A. A.; Jalar, A.; Shamsudin, R.

    2013-04-01

    Zinc oxide films were deposited on three different metal coated substrates (gold, nickel and platinum) by aqueous chemical growth method. This paper discusses the effect of metal coated substrates on the morphology and optical properties of grown ZnO films. X-Ray Diffraction (XRD), Field Emission Scanning Electron Microscopy (FE-SEM) and UV-visible spectroscopy (UV-vis) were employed to characterize the samples. All the as-deposited ZnO films exhibit crystalline hexagonal wurzite structure. The crystallite size of the ZnO films were in the range of 29 to 32 nm. FESEM micrographs revealed hexagonal rod, oval-like and flower-like ZnO structures formed on all metal coated substrates. The Pt coated film contains higher density hexagonal rod as compared to others metal coated substrate. Most probably the Pt lattice parameter is the nearest to ZnO compared to nickel and gold. The optical band gap energy, Eg of ZnO films were estimated to be 3.30 eV which is near to bulk Eg, 3.37 eV. This indicates that the ZnO grown by aqueous chemical growth is able to produce similar quality properties to other conventional method either films or bulk size.

  10. Crystallinity of Li-doped Gd2O3:Eu3+ thin-film phosphors grown on Si (100) substrate

    NASA Astrophysics Data System (ADS)

    Yi, Soung Soo; Bae, Jong Seong; Moon, Byung Kee; Jeong, Jung Hyun; Kim, Jung Hwan

    2005-02-01

    Gd2O3:Eu3+ and Li-doped Gd2O3:Eu3+ luminescent thin films have been grown on Si (100) substrates using pulsed-laser deposition. The films grown at different deposition conditions show different microstructural and luminescent characteristics. Both cubic and monoclinic crystalline structures were observed in both Gd2O3:Eu3+ and Li-doped Gd2O3:Eu3+ films, but the cubic phase becomes more dominant and the ratio of peak values IC(222)/IM(-402) increases rapidly for Li-doped Gd2O3:Eu3+ films. The photoluminescence brightness data obtained from Li-doped Gd2O3:Eu3+ films indicate that Si (100) is a promising substrate for growth of high-quality Li-doped Gd2O3:Eu3+ thin-film red phosphor. In particular, the incorporation of Li + ions into the Gd2O3 lattice induced changes of crystallinity, surface roughness, and photoluminescence. The highest emission intensity was observed with Gd1.84Li0.08Eu0.08O3, whose brightness was a factor of 2.1 larger than that from Gd2O3:Eu3+ films. This phosphor is promising for applications in flat-panel displays.

  11. Optical, Electrical, and UV Photoresponse Properties of Fluorine-Doped ZnO Thin Films Grown on Flexible Mica Substrates

    NASA Astrophysics Data System (ADS)

    Kim, Younggyu; Leem, Jae-Young

    2015-12-01

    Fluorine-doped ZnO (FZO) thin films have several potential applications, for instance, in low-cost optoelectronic devices; understanding how their optical, electrical, and photoresponse properties depend on and can be controlled via the synthesis conditions is essential for application of these systems. In this study, FZO thin films with different annealing temperatures were grown on muscovite mica substrates via sol-gel spin-coating. In photoluminescence measurements, a strong peak in the ultraviolet (UV) region and a broad peak in the visible region were observed for all films, being strongly dependent on the annealing temperature. The transmittance of the annealed films was slightly higher than that of as-grown film, and the absorption edges in the transmittance spectra red-shifted with increasing annealing temperature. The optical bandgap and Urbach energy of the films were calculated from the absorption coefficient values, using the Tauc and Urbach relations, respectively. Finally, the electrical (i.e., resistivity and carrier concentration) and photoresponse properties of the films were investigated to assess their applicability for use in FZO-based UV detectors.

  12. Microstructures of InN film on 4H-SiC (0001) substrate grown by RF-MBE

    NASA Astrophysics Data System (ADS)

    Jantawongrit, P.; Sanorpim, S.; Yaguchi, H.; Orihara, M.; Limsuwan, P.

    2015-08-01

    InN film was grown on 4H-SiC (0001) substrate by RF plasma-assisted molecular beam epitaxy (RF-MBE). Prior to the growth of InN film, an InN buffer layer with a thickness of ∼5.5 nm was grown on the substrate. Surface morphology, microstructure and structural quality of InN film were investigated. Micro-structural defects, such as stacking faults and anti-phase domain in InN film were carefully investigated using transmission electron microscopy (TEM). The results show that a high density of line contrasts, parallel to the growth direction (c-axis), was clearly observed in the grown InN film. Dark field TEM images recorded with diffraction vectors g=11\\bar{2}0 and g = 0002 revealed that such line contrasts evolved from a coalescence of the adjacent misoriented islands during the initial stage of the InN nucleation on the substrate surface. This InN nucleation also led to a generation of anti-phase domains. Project supported by the Thailand Center of Excellence in Physics (ThEP) and the King Mongkut's University of Technology Thonburi under The National Research University Project. One of the authors (S. Sanorpim) was supported by the National Research Council of Thailand (NRCT) and the Thai Government Stimulus Package 2 (TKK2555), under the Project for Establishment of Comprehensive Center for Innovative Food, Health Products and Agriculture.

  13. N-doped ZnO films grown from hybrid target by the pulsed laser deposition technique

    NASA Astrophysics Data System (ADS)

    Martín-Tovar, E. A.; Chan y Díaz, E.; Acosta, M.; Castro-Rodríguez, R.; Iribarren, A.

    2016-10-01

    ZnO thin films were grown by the pulsed laser deposition technique on glass substrate using a hybrid target composed of ZnO powder embedded into a poly(ethyl cyanoacrylate) matrix. The resulting thin film presented ZnO wurtzite structure with very low stress and diffractogram very similar to that of the powder pattern. From comparing with ZnO thin films grown from traditional sintered target, it is suggested that the use of this hybrid target with a soft matrix led to ejection of ZnO clusters that conveniently disposed and adhered to substrate and previous deposited layers. Chemical measurements showed the presence of Zn-N bonds, besides Zn-O ones. Optical absorption profile confirmed the presence of low-polymerized zinc oxynitride molecular subunits, besides ZnO.

  14. RBS and PIXE analysis of chlorine contamination in ALD-Grown TiN films on silicon

    SciTech Connect

    Meersschaut, J.; Witters, T.; Kaeyhkoe, M.; Lenka, H. P.; Vandervorst, W.; Zhao, Q.; Vantomme, A.

    2013-04-19

    The performance, strengths and limitations of RBS and PIXE for the characterization of trace amounts of Cl in TiN thin films are critically compared. The chlorine atomic concentration in ALD grown TiN thin films on Si is determined for samples grown at temperatures ranging from 350 Degree-Sign C to 550 Degree-Sign C. We show that routine Rutherford backscattering spectrometry measurements (1.5 MeV He{sup +}) and PIXE measurements (1.5 MeV H{sup +}) on 20 nm thick TiN films allow one to determine the Cl content down to 0.3 at% with an absolute statistical accuracy reaching 0.03 at%. Possible improvements to push the sensitivity limit for both approaches are proposed.

  15. UV/vis range photodetectors based on thin film ALD grown ZnO/Si heterojunction diodes

    NASA Astrophysics Data System (ADS)

    Alkis, Sabri; Tekcan, Burak; Nayfeh, Ammar; Kemal Okyay, Ali

    2013-10-01

    We present ultraviolet-visible (UV/vis) range photodetectors (PDs) based on thin film ZnO (n)/Si (p) heterojunction diodes. ZnO films are grown by the atomic layer deposition (ALD) technique at growth temperatures of 80, 150, 200 and 250 ° C. The fabricated ZnO (n)/Si (p) photodetectors (ZnO-Si-PDs) show good electrical rectification characteristics with ON/OFF ratios reaching up to 103. Under UV (350 nm wavelength) and visible (475 nm wavelength) light illumination, the ZnO-Si-PDs give photoresponsivity values of 30-37 mA W-1 and 74-80 mA W-1 at 0.5 V reverse bias, respectively. Photoluminescence (PL) spectra of ALD grown ZnO thin films are used to support the results.

  16. Improvement of laser molecular beam epitaxy grown SrTiO3 thin film properties by temperature gradient modulation growth

    NASA Astrophysics Data System (ADS)

    Li, Jin Long; Hao, J. H.; Li, Y. R.

    2007-09-01

    Oxygen diffusion at the SrTiO3/Si interface was analyzed. A method called temperature gradient modulation growth was introduced to control oxygen diffusion at the interface of SrTiO3/Si. Nanoscale multilayers were grown at different temperatures at the initial growing stage of films. Continuous growth of SrTiO3 films was followed to deposit on the grown sacrificial layers. The interface and crystallinity of SrTiO3/Si were investigated by in situ reflection high energy electron diffraction and x-ray diffraction measurements. It has been shown that the modulated multilayers may help suppress the interfacial diffusion, and therefore improve SrTiO3 thin film properties.

  17. Thermal and irradiation induced interdiffusion in magnetite thin films grown on magnesium oxide (0 0 1) substrates

    NASA Astrophysics Data System (ADS)

    Kim-Ngan, N.-T. H.; Balogh, A. G.; Meyer, J. D.; Brötz, J.; Zając, M.; Ślęzak, T.; Korecki, J.

    2009-05-01

    Epitaxial Fe 3O 4(0 0 1) thin films (with a thickness in the range of 10-20 nm) grown on MgO substrates were characterized using low-energy electron diffraction (LEED), conversion electron Mössbauer spectroscopy (CEMS) and investigated using Rutherford backscattering spectrometry (RBS), channeling (RBS-C) experiments and X-ray reflectometry (XRR). The Mg out-diffusion from the MgO substrate into the film was observed for the directly-deposited Fe 3O 4/MgO(0 0 1) films. For the Fe 3O 4/Fe/MgO(0 0 1) films, the Mg diffusion was prevented by the Fe layer and the surface layer is always a pure Fe 3O 4 layer. Annealing and ion beam mixing induced a very large interface zone having a spinel and/or wustite formula in the Fe 3O 4-on-Fe film system.

  18. Nanomechanical properties of SiC films grown from C{sub 60} precursors using atomic force microscopy

    SciTech Connect

    Morse, K.; Balooch, M.; Hamza, A.V.; Belak, J.

    1994-12-01

    The mechanical properties of SiC films grown via C{sub 60} precursors were determined using atomic force microscopy (AFM). Conventional silicon nitride and modified diamond cantilever AFM tips were employed to determine the film hardness, friction coefficient, and elastic modulus. The hardness is found to be between 26 and 40 GPa by nanoindentation of the film with the diamond tip. The friction coefficient for the silicon nitride tip on the SiC film is about one third that for silicon nitride sliding on a silicon substrate. By combining nanoindentation and AFM measurements an elastic modulus of {approximately}300 GPa is estimated for these SiC films. In order to better understand the atomic scale mechanisms that determine the hardness and friction of SiC, we simulated the molecular dynamics of a diamond indenting a crystalline SiC substrate.

  19. Mechanically tunable magnetic properties of Fe{sub 81}Ga{sub 19} films grown on flexible substrates

    SciTech Connect

    Dai Guohong; Zhan Qingfeng; Liu Yiwei; Yang Huali; Zhang Xiaoshan; Chen Bin; Li Runwei

    2012-03-19

    We investigated on magnetic properties of magnetostrictive Fe{sub 81}Ga{sub 19} films grown on flexible polyethylene terephthalate (PET) substrates under various mechanical strains. The unstrained Fe{sub 81}Ga{sub 19} films exhibit a significant uniaxial magnetic anisotropy due to a residual stress in PET substrates. It was found that the squareness of hysteresis loops can be tuned by an application of strains, inward/compressive or outward/tensile bending of the films. A modified Stoner-Wohlfarth model with considering a distribution of easy axes in polycrystalline films was developed to account for the mechanically tunable magnetic properties in flexible Fe{sub 81}Ga{sub 19} films. These results provide an alternative way to tune mechanically magnetic properties, which is particularly important for developing flexible magnetoelectronic devices.

  20. Epitaxial CuInSe2 thin films grown by molecular beam epitaxy and migration enhanced epitaxy

    NASA Astrophysics Data System (ADS)

    Abderrafi, K.; Ribeiro-Andrade, R.; Nicoara, N.; Cerqueira, M. F.; Gonzalez Debs, M.; Limborço, H.; Salomé, P. M. P.; Gonzalez, J. C.; Briones, F.; Garcia, J. M.; Sadewasser, S.

    2017-10-01

    While CuInSe2 chalcopyrite materials are mainly used in their polycrystalline form to prepare thin film solar cells, epitaxial layers have been used for the characterization of defects. Typically, epitaxial layers are grown by metal-organic vapor phase epitaxy or molecular beam epitaxy (MBE). Here we present epitaxial layers grown by migration enhanced epitaxy (MEE) and compare the materials quality to MBE grown layers. CuInSe2 layers were grown on GaAs (0 0 1) substrates by co-evaporation of Cu, In, and Se using substrate temperatures of 450 °C, 530 °C, and 620 °C. The layers were characterized by high resolution X-ray diffraction (HR-XRD), high-resolution transmission electron microscopy (HRTEM), Raman spectroscopy, and atomic force microscopy (AFM). HR-XRD and HR-TEM show a better crystalline quality of the MEE grown layers, and Raman scattering measurements confirm single phase CuInSe2. AFM shows the previously observed faceting of the (0 0 1) surface into {1 1 2} facets with trenches formed along the [1 1 0] direction. The surface of MEE-grown samples appears smoother compared to MBE-grown samples, a similar trend is observed with increasing growth temperature.

  1. Some of structural and morphological optimization of GaN thin film on Si(100) substrate grown by RF sputter

    NASA Astrophysics Data System (ADS)

    Mantarcı, Asim; Kundakçı, Mutlu

    2017-04-01

    One of important material of III-nitrides can be said to be GaN with direct-wide band gap ( 3.4 eV) and many industrial devices such as solar cell, LED has been based on GaN thin film. In this research, we elaborately investigated growth of GaN thin film on Si(100) substrate by RF sputter technique and characterization of the film. We have successfully grown GaN thin film on Si substrate with hexagonal structure which has been confirmed by analysis of X-ray measurements. Also, we obtained structural properties of GaN film by (XRD) X-ray Diffraction measurements depending on different Argon, nitrogen and RF power values. During experiment, the value from 25sccm to 100sccm Argon gas value, the value from 0sccm to 4sccm Nitrogen gas value and from 50 watt to 125 watt RF power value has been applied. Among these values, we determined the best film in terms of crystalline structure of film. From AFM results, we attained and analyzed average roughness (Ra), maximum peak height (Rp), and maximum depth (Rv), average absolute slope of the profile (Δa)(°) of the fılms successfully. The film having the lowest roughness (Ra) has been achieved depending on different Argon, nitrogen and RF power values. Atomic Force Microscopy results confirmed that some of the films have homogeneous and uniform structure without any holes and crack; but others has voids referring impurities coming from growth process. To sum up, not only growing GaN thin film on Si substrate has been investigated, but also some of structural and morphological parameters' optimization has been studied, analyzed and the best film was determined in view of varied Argon, nitrogen and RF power values. For future direction, optimization of GaN thin film in detail can enable us to fabricate high quality film; therefore it will helps to improving device technology.

  2. Electrical and optical properties of Y-doped indium zinc oxide films grown by RF magnetron sputtering.

    PubMed

    Lee, Young-Jun; Kim, Joo-Hyung; Oh, Byeong-Yun; Kim, Kwang-Young

    2013-09-01

    Y2O3-doped IZO (YIZO) films was investigated in order to control the carrier concentration of semiconducting IZO layer. Stoichiometric thin YIZO films were deposited on glass substrates by RF magnetron sputtering method using indium zinc oxide (IZO) including 50 wt.% ZnO and Y2O3 targets. During the deposition of YIZO films, the working pressure was fixed at 0.17 Pa and the deposition temperature was kept at room temperature while the oxygen partial pressure (P(O2)) was changed to find the optimal film condition. In order to check the PO2 effect on structural, electrical and optical properties of the grown YIZO layer on glass, X-ray diffraction (XRD) was employed to analyze the structure of YIZO films and the electrical properties were characterized by Hall measurements using the Van der Pauw geometry at room temperature. From the measured XRD patterns, exhibiting crystalline peak of the YIZO film deposited under PO2 condition is revealed while amorphous phase structure is only observed from the YIZO film deposited under pure Ar gas condition. As the O2 contents in gas increase, the resistivity of YIZO film also drastically increases, whereas the carrier concentration of the YIZO films sharply decreases with mobility.

  3. Structure and magnetic properties of electrodeposited, ferromagnetic, group 3-d element films grown onto GaAs (011) substrate

    NASA Astrophysics Data System (ADS)

    Scheck, C.; Evans, P.; Schad, R.; Zangari, G.

    2003-05-01

    Ni, Co, and iron-rich FeNi films were grown onto n-GaAs (011) substrates using electrodeposition from metal sulfate solutions, at room temperature, with a current density of 3.5 mA/cm2 at a pH of 2.5. The structure of Ni film is found to be fcc with a (111) preferred orientation, whereas Co films show a mixed fcc and hcp structure that is confirmed by x-ray diffraction and transmission electron microscopy data. The structure of iron-rich (>90%) FeNi films remains unclear at the moment. The films show a well-defined, in-plane, uniaxial anisotropy with the easy axis along the [011] GaAs direction for Ni, and [011¯] GaAs direction for Co and FeNi films (i.e., anisotropy rotated by 90° compared to Ni). Co films maintain their anisotropy even for large thicknesses (>250 nm) and so does Ni (up to 90 nm). Surprisingly, thin Ni films exhibit a larger HK value (950 Oe) than what would be expected from a purely crystalline anisotropy. This effect is ascribed to internal stresses in the as-deposited films.

  4. Investigation of bonded hydrogen defects in nanocrystalline diamond films grown with nitrogen/methane/hydrogen plasma at high power conditions

    NASA Astrophysics Data System (ADS)

    Tang, C. J.; Hou, Haihong; Fernandes, A. J. S.; Jiang, X. F.; Pinto, J. L.; Ye, H.

    2017-02-01

    In this work, we investigate the influence of some growth parameters such as high microwave power ranging from 3.0 to 4.0 kW and N2 additive on the incorporation of bonded hydrogen defects in nanocrystalline diamond (NCD) films grown through a small amount of pure N2 addition into conventional 4% CH4/H2 plasma using a 5 kW microwave plasma CVD system. Incorporation form and content of hydrogen point defects in the NCD films produced with pure N2 addition was analyzed by employing Fourier-transform infrared (FTIR) spectroscopy for the first time. A large amount of hydrogen related defects was detected in all the produced NCD films with N2 additive ranging from 29 to 87 μm thick with grain size from 47 nm to 31 nm. Furthermore, a specific new H related sharp absorption peak appears in all the NCD films grown with pure N2/CH4/H2 plasma at high powers and becomes stronger at powers higher than 3.0 kW and is even stronger than the 2920 cm-1 peak, which is commonly found in CVD diamond films. Based on these experimental findings, the role of high power and pure nitrogen addition on the growth of NCD films including hydrogen defect formation is analyzed and discussed.

  5. Effect of nitrogen addition on the microstructure and mechanical properties of diamond films grown using high-methane concentrations

    NASA Astrophysics Data System (ADS)

    Catledge, Shane A.; Vohra, Yogesh K.

    1999-07-01

    We report on the microstructure and mechanical properties of diamond films grown using varying nitrogen additions to a plasma with a high-CH4 fraction of 15% (in hydrogen) and an operating pressure of 125 Torr. Films were grown at N2/CH4 ratios ranging from 0 to 0.30 by fixing the CH4 flow rate and changing only the N2 flow rate. With increasing nitrogen addition, we observe an increase in intensity and a decrease in the full width at half maximum (FWHM) of the Raman band at 1550 cm-1, while the crystalline diamond peak at 1332 cm-1 decreases in intensity and increases in the FWHM. X-ray diffraction confirms that the film crystallinity and diamond grain size decrease rapidly with increasing nitrogen additions up to a N2/CH4 ratio of 0.10, but then do not change significantly above this ratio. A similar trend is observed for film surface roughness. In addition, we find from indentation testing that all films exhibit high hardness values ranging from 70 to 90 GPa and that the toughness of the films improves with increasing nitrogen addition. Optical emission spectroscopy reveals that an increase in CN species relative to C2 in the plasma is responsible for the formation of tetrahedral amorphous carbon (indicated by the Raman band at 1550 cm-1).

  6. Annealing Effect on the Structural and Optical Properties of Sputter-Grown Bismuth Titanium Oxide Thin Films

    PubMed Central

    Alfonso, José E.; Olaya, Jhon J.; Bedoya-Hincapié, Claudia M.; Toudert, Johann; Serna, Rosalia

    2014-01-01

    The aim of this work is to assess the evolution of the structural and optical properties of BixTiyOz films grown by rf magnetron sputtering upon post-deposition annealing treatments in order to obtain good quality films with large grain size, low defect density and high refractive index similar to that of single crystals. Films with thickness in the range of 220–250 nm have been successfully grown. After annealing treatment at 600 °C the films show excellent transparency and full crystallization. It is shown that to achieve larger crystallite sizes, up to 17 nm, it is better to carry the annealing under dry air than under oxygen atmosphere, probably because the nucleation rate is reduced. The refractive index of the films is similar under both atmospheres and it is very high (n =2.5 at 589 nm). However it is still slightly lower than that of the single crystal value due to the polycrystalline morphology of the thin films. PMID:28788626

  7. Interfacially engineered oxygen octahedral rotations and their impact on strain relief in coherently grown SrRu O3 films

    NASA Astrophysics Data System (ADS)

    Kan, Daisuke; Wakabayashi, Yusuke; Tajiri, Hiroo; Shimakawa, Yuichi

    2016-07-01

    We report synchrotron x-ray diffraction investigations of interfacially engineered oxygen octahedral rotations and their impact on strain relief in perovskite SrRu O3 films. We show that octahedral rotations with distinct patterns and magnitudes can be accommodated into coherently grown films. The SrRu O3 film grown directly on the GdSc O3 substrate has the Ru O6 octahedral rotation with the a-b+c- pattern in the Glazer notation and the rotation angles of αrot=6.6 ±0 .2∘ , βrot=5.5 ±0 .2∘ , and γrot=3.6 ±0 .2∘ . On the other hand, when a 1-nm-thick BaTi O3 layer without Ti O6 rotations is inserted between the SrRu O3 and GdSc O3 , the SrRu O3 has the Ru O6 rotation with a-b0c+ , and αrot=5.6 ±0 .8∘ and γrot=3.6 ±0 .8∘ . These results indicate that there are some degrees of freedom in the octahedral rotations accommodated in SrRu O3 depending on the interface structure and that the γrot rotations play the important roles in the film's structural properties when the rotation about the [010] pc axis is blocked. We also found that the strain relief in the film is influenced by the interfacially engineered octahedral rotations. The interfacial BaTi O3 layer results in the in-plane periodic lattice modulation in the t-SRO film, allowing for the anisotropic relief of the substrate-induced strain. The results highlight the importance of the interface structure as a factor, determining not only octahedral rotations in coherently grown SRO films but also the strain reliefs in them.

  8. (110)-oriented indium tin oxide films grown on m- and r-plane sapphire substrates

    NASA Astrophysics Data System (ADS)

    Chern, Ming-Yau; Lu, Tso-Wen; Xu, Wei-Lun

    2015-04-01

    Indium tin oxide (ITO) thin films have been deposited by pulsed laser deposition on m-plane (100) and r-plane (012) sapphire substrates. For both substrates, the films were grown with their [110] direction perpendicular to the substrate planes under the conditions of high growth temperature and high oxygen pressure. Their in-plane epitaxial relations with the substrates were identified to be ITO[001] ∥ Al2O3[020] and \\text{ITO}[1\\bar{1}0]\\parallel \\text{Al}2\\text{O}3[001] for the m-plane substrate. For the r-plane substrate, two types of lattice matching were observed: one being \\text{ITO}[001]\\parallel \\text{Al}2\\text{O}3[2,1, - 1/2] and \\text{ITO}[1\\bar{1}0]\\parallel \\text{Al}2\\text{O}3[4/3, - 4/3,2/3], the other being \\text{ITO}[001]\\parallel \\text{Al}2\\text{O}3[1, - 1,1/2] and \\text{ITO}[1\\bar{1}0]/\\text{Al}2\\text{O}3[8/3,4/3, - 2/3]. The electrical properties were measured by the Hall effect and van der Pauw methods at room temperature. All of the samples have low electrical resistivity on the order of 3.0 × 10-4 Ω cm, high carrier concentration of about 2.5 × 1020 cm-3, and mobility ranging from 70 to 90 cm2 V-1 s-1.

  9. Determination of the two-photon absorption cross-section of magnetite and manganese ferrite nanoparticles in ferrofluids and thin films (Conference Presentation)

    NASA Astrophysics Data System (ADS)

    Espinosa, Daniel; Gonçalves, Eduardo S.; Figueiredo Neto, Antonio M.

    2017-02-01

    Nonlinear optical properties of colloids have technological appeal, since nanoparticles with nonlinear optical properties can be combined with the fluidity of liquid carriers, in the emerging area of Optofluidics. Ferrofluids, especially, can be used in magnetically-controllable applications or in optical limiting devices, where nonlinear absorption is a key characteristic. Besides two-photon absorption, some phenomena are present in experimental studies in optical nonlinearities of colloids: the particles can absorb light and heat the liquid around it, giving rise to a temperature and a subsequent refractive index gradient, what originates a thermo-optical self-focusing; also, the temperature gradient can drive the particles inward or outward the illuminated region, what changes the refractive index and the absorption coefficient of the material. In this work, the z-scan technique is performed in ferrofluids and thin films made from ferrofluids to measure the two-photon absorption coefficient of magnetite and manganese ferrite nanoparticles and to determine their two-photon absorption cross-section (σ2PA). To avoid the influence of the cited thermo-optical effects in these measurements, the frequency of the pulsed Gaussian beam (pulse width of 196 fs) is decreased with an electro-optic modulator and a shutter is used to allow the measurement of the nonlinear effects, present at the first pulse illuminating the sample, after a period of 2 seconds without illumination. The z-scan curves with and without using shutter are compared in colloids and thin films. The achieved values of σ2PA at 800 nm are 50 GM and 107 GM, for the magnetite and manganese ferrite nanoparticles, respectively.

  10. Small high directivity ferrite antennas

    NASA Astrophysics Data System (ADS)

    Wright, T. M. B.

    A centimeter-wavelength antenna of millimetric dimensions, which uses the intrinsic angular sensitivity of ferrites, is described, with an emphasis on the modification of the material's permeability. The construction of both the ferrite film lens antenna and the ferrite film cassegrain antenna are detailed; both can be devised in a number of configurations for appropriate beam positioning and rf filtering. The antenna design, discussed primarily in the context of smart missiles, electronic warfare, and satellite systems, presents the possibility of magnetically switching between the transmit and receive modes within the antenna structure itself. Finally, it is noted that for a simple 2-dipole array the angular resolution can be two orders of magnitude higher than with the conventional techniques.

  11. P-doped strontium titanate grown using two target pulsed laser deposition for thin film solar cells

    NASA Astrophysics Data System (ADS)

    Man, Hamdi

    Thin-film solar cells made of Mg-doped SrTiO3 p-type absorbers are promising candidates for clean energy generation. This material shows p-type conductivity and also demonstrates reasonable absorption of light. In addition, p-type SrTiO3 can be deposited as thin films so that the cost can be lower than the competing methods. In this work, Mg-doped SrTiO3 (STO) thin-films were synthesized and analyzed in order to observe their potential to be employed as the base semiconductor in photovoltaic applications. Mg-doped STO thin-films were grown by using pulsed laser deposition (PLD) using a frequency quadrupled Yttrium Aluminum Garnet (YAG) laser and with a substrate that was heated by back surface absorption of infrared (IR) laser light. The samples were characterized using X-ray photoelectron spectroscopy (XPS) and it was observed that Mg atoms were doped successfully in the stoichiometry. Reflection high energy electron diffraction (RHEED) spectroscopy proved that the thin films were polycrystalline. Kelvin Probe work function measurements indicated that the work function of the films were 4.167 eV after annealing. UV/Vis Reflection spectroscopy showed that Mg-doped STO thin-films do not reflect significantly except in the ultraviolet region of the spectrum where the reflection percentage increased up to 80%. Self-doped STO thin-films, Indium Tin Oxide (ITO) thin films and stainless steel foil (SSF) were studied in order to observe their characteristics before employing them in Mg-doped STO based solar cells. Self-doped STO thin films were grown using PLD and the results showed that they are capable of serving as the n-type semiconductor in solar cell applications with oxygen vacancies in their structure and low reflectivity. Indium Tin Oxide thin-films grown by PLD system showed low 25-50 ?/square sheet resistance and very low reflection features. Finally, commercially available stainless steel foil substrates were excellent substrates for the inexpensive growth of

  12. Growth mechanism and composition of ultrasmooth a-C:H:Si films grown from energetic ions for superlubricity

    SciTech Connect

    Chen, Xinchun Kato, Takahisa

    2014-01-28

    Growth mechanism and ion energy dependence of composition of ultrasmooth a-C:H:Si films grown from ionization of tetramethylsilane (TMS) and toluene mixture at a fixed gas ratio have been investigated by varying the applied bias voltage. The dynamic scaling theory is employed to evaluate the roughness evolution of a-C:H:Si films, and to extract roughness and growth exponents of α ∼ 0.51 and β ∼ 0, respectively. The atomically smooth surface of a-C:H:Si films with Ra ∼ 0.1 nm is thermally activated by the energetic ion-impact induced subsurface “polishing” process for ion dominated deposition. The ion energy (bias voltage) plays a paramount role in determining the hydrogen incorporation, bonding structure and final stoichiometry of a-C:H:Si films. The hydrogen content in the films measured by ERDA gradually decreases from 36.7 to 17.3 at. % with increasing the bias voltage from 0.25 to 3.5 kV, while the carbon content in the films increases correspondingly from 52.5 to 70.1 at. %. The Si content is kept almost constant at ∼9–10 at. %. Depending on the ion-surface interactions, the bonding structure of a-C:H:Si films grown in different ion energy regions evolves from chain-developed polymer-like to cross-linked diamond-like to sp{sup 2}-bonded a–C as revealed by XPS, Raman, and FTIR analysis. Such a structural evolution is reflected in their measured nanomechanical properties such as hardness, modulus, and compressive stress. An enhanced viscoplastic behavior (i.e., viscoplastic exponent of ∼0.06) is observed for polymeric a-C:H:Si films. A hydrogen content threshold (H > 20 at. %) exists for the as-grown a-C:H:Si films to exhibit superlow friction in dry N{sub 2} atmosphere. An extremely low friction coefficient of ∼0.001 can be obtained for polymer-like a-C:H:Si film. These near-frictionless a-C:H:Si films are strongly promising for applications in industrial lubricating systems.

  13. Growth mechanism and composition of ultrasmooth a-C:H:Si films grown from energetic ions for superlubricity

    NASA Astrophysics Data System (ADS)

    Chen, Xinchun; Kato, Takahisa

    2014-01-01

    Growth mechanism and ion energy dependence of composition of ultrasmooth a-C:H:Si films grown from ionization of tetramethylsilane (TMS) and toluene mixture at a fixed gas ratio have been investigated by varying the applied bias voltage. The dynamic scaling theory is employed to evaluate the roughness evolution of a-C:H:Si films, and to extract roughness and growth exponents of α ˜ 0.51 and β ˜ 0, respectively. The atomically smooth surface of a-C:H:Si films with Ra ˜ 0.1 nm is thermally activated by the energetic ion-impact induced subsurface "polishing" process for ion dominated deposition. The ion energy (bias voltage) plays a paramount role in determining the hydrogen incorporation, bonding structure and final stoichiometry of a-C:H:Si films. The hydrogen content in the films measured by ERDA gradually decreases from 36.7 to 17.3 at. % with increasing the bias voltage from 0.25 to 3.5 kV, while the carbon content in the films increases correspondingly from 52.5 to 70.1 at. %. The Si content is kept almost constant at ˜9-10 at. %. Depending on the ion-surface interactions, the bonding structure of a-C:H:Si films grown in different ion energy regions evolves from chain-developed polymer-like to cross-linked diamond-like to sp2-bonded a-C as revealed by XPS, Raman, and FTIR analysis. Such a structural evolution is reflected in their measured nanomechanical properties such as hardness, modulus, and compressive stress. An enhanced viscoplastic behavior (i.e., viscoplastic exponent of ˜0.06) is observed for polymeric a-C:H:Si films. A hydrogen content threshold (H > 20 at. %) exists for the as-grown a-C:H:Si films to exhibit superlow friction in dry N2 atmosphere. An extremely low friction coefficient of ˜0.001 can be obtained for polymer-like a-C:H:Si film. These near-frictionless a-C:H:Si films are strongly promising for applications in industrial lubricating systems.

  14. Dynamics of surface evolution in semiconductor thin films grown from a chemical bath

    PubMed Central

    Gupta, Indu; Mohanty, Bhaskar Chandra

    2016-01-01

    Dynamics of surface evolution in CdS thin films grown by chemical bath deposition technique has been studied from time sequence of atomic force micrographs. Detailed scaling analysis of surface fluctuation in real and Fourier space yielded characteristic exponents αloc = 0.78 ± 0.07, α = 2.20 ± 0.08, αs = 1.49 ± 0.22, β = 0.86 ± 0.05 and βloc = 0.43 ± 0.10, which are very different from those predicted by the local growth models and are not related to any known universality classes. The observed anomalous scaling pattern, characterized by power law scaling dependence of interface width on deposition time differently at local and global scale, with rapid roughening of the growth front has been discussed to arise as a consequence of a nonlocal effect in the form of diffusional instability. PMID:27615367

  15. Surface cleaning procedures for thin films of indium gallium nitride grown on sapphire

    NASA Astrophysics Data System (ADS)

    Douglass, K.; Hunt, S.; Teplyakov, A.; Opila, R. L.

    2010-12-01

    Surface preparation procedures for indium gallium nitride (InGaN) thin films were analyzed for their effectiveness for carbon and oxide removal as well as for the resulting surface roughness. Aqua regia (3:1 mixture of concentrated hydrochloric acid and concentrated nitric acid, AR), hydrofluoric acid (HF), hydrochloric acid (HCl), piranha solution (1:1 mixture of sulfuric acid and 30% H 2O 2) and 1:9 ammonium sulfide:tert-butanol were all used along with high temperature anneals to remove surface contamination. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were utilized to study the extent of surface contamination and surface roughness, respectively. The ammonium sulfide treatment provided the best overall removal of oxygen and carbon. Annealing over 700 °C after a treatment showed an even further improvement in surface contamination removal. The piranha treatment resulted in the lowest residual carbon, while the ammonium sulfide treatment leads to the lowest residual oxygen. AFM data showed that all the treatments decreased the surface roughness (with respect to as-grown specimens) with HCl, HF, (NH 4) 2S and RCA procedures giving the best RMS values (˜0.5-0.8 nm).

  16. Fundamental reliability of 1.5-nm-thick silicon oxide gate films grown at 150 deg. C by modified reactive ion beam deposition

    SciTech Connect

    Yamada, Hiroshi

    2008-01-15

    The reliability of 1.5-nm-thick silicon oxide gate films grown at 150 deg. C by modified reactive ion beam deposition (RIBD) with in situ pyrolytic-gas passivation (PGP) using N{sub 2}O and NF{sub 3} was investigated. RIBD uses low-energy-controlled reactive, ionized species and potentializes low-temperature film growth. Although the oxide films were grown at a low temperature of 150 deg. C, their fundamental indices of reliability, such as the time-dependent dielectric breakdown lifetime and interface state density, were almost equivalent to those of oxide films grown at 850 deg. C using a furnace. This is probably due to localized interfacial N and F atoms. The number density of interfacial N atoms was about seven times larger than that for the furnace-grown oxide films, and this is a key factor for improving the reliability through the compensation of residual inconsistent-state bonding sites.

  17. Perpendicular Magnetic Anisotropy and Spin Glass-like Behavior in Molecular Beam Epitaxy Grown Chromium Telluride Thin Films.

    PubMed

    Roy, Anupam; Guchhait, Samaresh; Dey, Rik; Pramanik, Tanmoy; Hsieh, Cheng-Chih; Rai, Amritesh; Banerjee, Sanjay K

    2015-04-28

    Reflection high-energy electron diffraction (RHEED), scanning tunneling microscopy (STM), vibrating sample magnetometry, and other physical property measurements are used to investigate the structure, morphology, magnetic, and magnetotransport properties of (001)-oriented Cr2Te3 thin films grown on Al2O3(0001) and Si(111)-(7×7) surfaces by molecular beam epitaxy. Streaky RHEED patterns indicate flat smooth film growth on both substrates. STM studies show the hexagonal arrangements of surface atoms. Determination of the lattice parameter from the atomically resolved STM image is consistent with the bulk crystal structures. Magnetic measurements show the film is ferromagnetic, having a Curie temperature of about 180 K, and a spin glass-like behavior was observed below 35 K. Magnetotransport measurements show the metallic nature of the film with a perpendicular magnetic anisotropy along the c-axis.

  18. Low-relaxation spin waves in laser-molecular-beam epitaxy grown nanosized yttrium iron garnet films

    SciTech Connect

    Lutsev, L. V. Korovin, A. M.; Bursian, V. E.; Gastev, S. V.; Fedorov, V. V.; Suturin, S. M.; Sokolov, N. S.

    2016-05-02

    Synthesis of nanosized yttrium iron garnet (Y{sub 3}Fe{sub 5}O{sub 12}, YIG) films followed by the study of ferromagnetic resonance (FMR) and spin wave propagation in these films is reported. The YIG films were grown on gadolinium gallium garnet substrates by laser molecular beam epitaxy. It has been shown that spin waves propagating in YIG deposited at 700 °C have low damping. At the frequency of 3.29 GHz, the spin-wave damping parameter is less than 3.6 × 10{sup −5}. Magnetic inhomogeneities of the YIG films give the main contribution to the FMR linewidth. The contribution of the relaxation processes to the FMR linewidth is as low as 1.2%.

  19. Critical thickness and strain relaxation in molecular beam epitaxy-grown SrTiO3 films

    NASA Astrophysics Data System (ADS)

    Wang, Tianqi; Ganguly, Koustav; Marshall, Patrick; Xu, Peng; Jalan, Bharat

    2013-11-01

    We report on the study of the critical thickness and the strain relaxation in epitaxial SrTiO3 film grown on (La0.3Sr0.7)(Al0.65Ta0.35)O3 (001) (LSAT) substrate using the hybrid molecular beam epitaxy approach. No change in the film's lattice parameter (both the in-plane and the out-of-plane) was observed up to a film thickness of 180 nm, which is in sharp contrast to the theoretical critical thickness of ˜12 nm calculated using the equilibrium theory of strain relaxation. For film thicknesses greater than 180 nm, the out-of-plane lattice parameter was found to decrease hyperbolically in an excellent agreement with the relaxation via forming misfit dislocations. Possible mechanisms are discussed by which the elastic strain energy can be accommodated prior to forming misfit dislocations leading to such anomalously large critical thickness.

  20. Study of optical and structural properties of CZTS thin films grown by co-evaporation and spray pyrolysis

    NASA Astrophysics Data System (ADS)

    Moreno, R.; Ramirez, E. A.; Gordillo Guzmán, G.

    2016-02-01

    Results regarding optical and structural properties of Cu2ZnSnS4 (CZTS) thin films prepared by co-evaporation using a novel procedure are compared with those obtained with CZTS films grown using a solution based route. The lattice strain ε and crystallite size D of CZTS films prepared by co-evaporation and by spray pyrolysis were estimated through X-ray diffraction (XRD) measurements using Williamson-Hall-isotropic strain model. The results of estimated average crystallite size of CZTS films by Scherrer and Williamson-Hall plot methods were compared with AFM (atomic force microscopy) measurements. It was found that the average crystallite size measured by Williamson-Hall plot methods agree quite well with AFM results. Further, information regarding the influence of preparation method on both, crystalline phases and the formation of structural defects was achieved through Raman and Urbach energy measurements.

  1. Low-damping sub-10-nm thin films of lutetium iron garnet grown by molecular-beam epitaxy

    NASA Astrophysics Data System (ADS)

    Jermain, C. L.; Paik, H.; Aradhya, S. V.; Buhrman, R. A.; Schlom, D. G.; Ralph, D. C.

    2016-11-01

    We analyze the structural and magnetic characteristics of (111)-oriented lutetium iron garnet (Lu3Fe5O12) films grown by molecular-beam epitaxy, for films as thin as 2.8 nm. Thickness-dependent measurements of the in- and out-of-plane ferromagnetic resonance allow us to quantify the effects of two-magnon scattering, along with the surface anisotropy and the saturation magnetization. We achieve effective damping coefficients of 11.1 (9 )×10-4 for 5.3 nm films and 32 (3 )×10-4 for 2.8 nm films, among the lowest values reported to date for any insulating ferrimagnetic sample of comparable thickness.

  2. Hole-dominated transport in InSb nanowires grown on high-quality InSb films

    NASA Astrophysics Data System (ADS)

    Algarni, Zaina; George, David; Singh, Abhay; Lin, Yuankun; Philipose, U.

    2016-12-01

    We have developed an effective strategy for synthesizing p-type indium antimonide (InSb) nanowires on a thin film of InSb grown on glass substrate. The InSb films were grown by a chemical reaction between S b 2 S 3 and I n and were characterized by structural, compositional, and optical studies. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) studies reveal that the surface of the substrate is covered with a polycrystalline InSb film comprised of sub-micron sized InSb islands. Energy dispersive X-ray (EDX) results show that the film is stoichiometric InSb. The optical constants of the InSb film, characterized using a variable-angle spectroscopic ellipsometer (VASE) shows a maximum value for refractive index at 3.7 near 1.8 eV, and the extinction coefficient (k) shows a maximum value 3.3 near 4.1 eV. InSb nanowires were subsequently grown on the InSb film with 20 nm sized Au nanoparticles functioning as the metal catalyst initiating nanowire growth. The InSb nanowires with diameters in the range of 40-60 nm exhibit good crystallinity and were found to be rich in Sb. High concentrations of anions in binary semiconductors are known to introduce acceptor levels within the band gap. This un-intentional doping of the InSb nanowire resulting in hole-dominated transport in the nanowires is demonstrated by the fabrication of a p-channel nanowire field effect transistor. The hole concentration and field effect mobility are estimated to be ≈1.3 × 1017 cm-3 and 1000 cm2 V-1 s-1, respectively, at room temperature, values that are particularly attractive for the technological implications of utilizing p-InSb nanowires in CMOS electronics.

  3. Structural, morphological and optical characterizations of ZnO:Al thin films grown on silicon substrates by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Alyamani, A.; Sayari, A.; Albadri, A.; Albrithen, H.; El Mir, L.

    2016-09-01

    The pulsed laser deposition (PLD) technique is used to grow Al-doped ZnO (AZO) thin films at 500 ° C on silicon substrates under vacuum or oxygen gas background from ablating AZO nanoparticle targets synthesized via the sol-gel process. The structural, morphological and optical properties were characterized by using X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM) and spectroscopic ellipsometry (SE) techniques. XRD and TEM images show that AZO powder has a wurtzite-type structure and is composed of small prismatic-like shape nanoparticles with an average size of 30nm. The structural properties of the AZO films grown under oxygen show no significant changes compared to those of the film grown under vacuum. However, the optical properties show a dependence on the growth conditions of the AZO films. Highly c -axis-oriented AZO thin films were obtained with grain size ˜ 15 nm. The stress in the AZO films is tensile as measured from the c -parameter. The dielectric function, the refractive index and the extinction coefficient as a function of the photon energy for the AZO films were determined by using spectroscopic ellipsometry measurements in the photon energy region from 1 to 6eV. The band gap energy was observed to slightly decrease in the presence of the O2 gas background and this may be attributed to the stress. The surface and volume energy loss functions are calculated and exhibit different behaviors in the energy range 1-6eV. Refractive indices of 1.9-2.1 in the visible region were obtained for the AZO films. Also, the electronic carrier concentration appears to be related to the presence of O2 during the growth process.

  4. High Stability Electron Field Emitters Synthesized via the Combination of Carbon Nanotubes and N₂-Plasma Grown Ultrananocrystalline Diamond Films.

    PubMed

    Chang, Ting-Hsun; Hsieh, Ping-Yen; Kunuku, Srinivasu; Lou, Shiu-Cheng; Manoharan, Divinah; Leou, Keh-Chyang; Lin, I-Nan; Tai, Nyan-Hwa

    2015-12-16

    An electron field emitter with superior electron field emission (EFE) properties and improved lifetime stability is being demonstrated via the combination of carbon nanotubes and the CH4/N2 plasma grown ultrananocrystalline diamond (N-UNCD) films. The resistance of the carbon nanotubes to plasma ion bombardment is improved by the formation of carbon nanocones on the side walls of the carbon nanotubes, thus forming strengthened carbon nanotubes (s-CNTs). The N-UNCD films can thus be grown on s-CNTs, forming N-UNCD/s-CNTs carbon nanocomposite materials. The N-UNCD/s-CNTs films possess good conductivity of σ = 237 S/cm and marvelous EFE properties, such as low turn-on field of (E0) = 3.58 V/μm with large EFE current density of (J(e)) = 1.86 mA/cm(2) at an applied field of 6.0 V/μm. Moreover, the EFE emitters can be operated under 0.19 mA/cm(2) for more than 350 min without showing any sign of degradation. Such a superior EFE property along with high robustness characteristic of these combination of materials are not attainable with neither N-UNCD films nor s-CNTs films alone. Transmission electron microscopic investigations indicated that the N-UNCD films contain needle-like diamond grains encased in a few layers of nanographitic phase, which enhanced markedly the transport of electrons in the N-UNCD films. Moreover, the needle-like diamond grains were nucleated from the s-CNTs without the necessity of forming the interlayer that facilitate the transport of electrons crossing the diamond-to-Si interface. Both these factors contributed to the enhanced EFE behavior of the N-UNCD/s-CNTs films.

  5. Characterization of the microstructure of GaP films grown on {111} Si by liquid phase epitaxy.

    PubMed

    Huang, Susan R; Lu, Xuesong; Barnett, Allen; Opila, Robert L; Mogili, Vishnu; Tanner, David A; Nakahara, Shohei

    2014-11-12

    The development of a cost-effective Si based platform on which III-V's can be grown is of great interest. This work investigates the morphology of gallium phosphide (GaP) films grown on {111} silicon (Si) substrates by means of liquid phase epitaxy in a tin (Sn) - based solvent bath. Two types of single-crystal {111} Si substrates were used; the first type was oriented exactly along the ⟨111⟩ surface (no-miscut) and the second was miscut by 4°. The growth rate of the GaP films was found to be markedly different for the two types of substrates; the GaP films on the miscut Si substrate grew ∼4 times faster than those on the no-miscut substrate. The GaP films grew epitaxially on both types of substrates, but contained Si and Sn as inclusions. In the case of the no-miscut substrate, a number of large Sn particles were incorporated at the GaP/Si interface. As a result, these interfacial Sn particles affected the strain state of the GaP films dramatically, which, in turn, manifested itself in the form of a duplex microstructure that consists of strained and strain-free regions.

  6. Illumination effects on the ferroelectric properties of zinc oxide films grown by DC-unbalanced magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Kurniawan, R.; Willy, F.; Nurfani, E.; Muhammady, S.; Sutjahja, I. M.; Winata, T.; Darma, Y.

    2017-02-01

    We study the illumination effect on the ferroelectric properties of zinc oxide (ZnO) film grown by DC-unbalanced magnetron sputtering. We focus on the P–E hysteresis response of the as-grown ZnO (ag-ZnO) and annealed-ZnO (ann-ZnO) films under dark and light conditions. The measurement of ferroelectric properties is performed by driving a positive voltage on the top-side of the films. Under the dark condition, a strong P–E response is observable on the ann-ZnO film due to the structural enhancement. The value of electrical coercivity for ferroelectric polarization is strongly related to the light illumination. The illumination treatment changed the P–E hysteresis of the ZnO films from symmetric to asymmetric. We found that higher energy illumination promotes a higher electric coercivity. These results confirmed that ferroelectric properties could be effectively tailored by tuning the energy of the light source. This interrelated electrical and optical properties is an important phenomenon to design a new light-induced non-volatile device application.

  7. Structural, morphological and mechanical properties of niobium nitride thin films grown by ion and electron beams emanated from plasma

    NASA Astrophysics Data System (ADS)

    Siddiqui, Jamil; Hussain, Tousif; Ahmad, Riaz; Umar, Zeeshan A.; Abdus Samad, Ubair

    2016-05-01

    The influence of variation in plasma deposition parameters on the structural, morphological and mechanical characteristics of the niobium nitride films grown by plasma-emanated ion and electron beams are investigated. Crystallographic investigation made by X-ray diffractometer shows that the film synthesized at 10 cm axial distance with 15 plasma focus shots (PFS) exhibits better crystallinity when compared to the other deposition conditions. Morphological analysis made by scanning electron microscope reveals a definite granular pattern composed of homogeneously distributed nano-spheroids grown as clustered particles for the film synthesized at 10 cm axial distance for 15 PFS. Roughness analysis demonstrates higher rms roughness for the films synthesized at shorter axial distance and by greater number of PFS. Maximum niobium atomic percentage (35.8) and maximum average hardness (19.4 ± 0.4 GPa) characterized by energy-dispersive spectroscopy and nano-hardness analyzer respectively are observed for film synthesized at 10 cm axial distance with 15 PFS.

  8. Interface morphology studies of liquid phase epitaxy grown HgCdTe films by atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Azoulay, M.; George, M. A.; Burger, A.; Collins, W. E.; Silberman, E.

    1994-04-01

    In this paper we report an investigation of the morphology of the interfaces of liquid phase epitaxy (LPE) grown HgCdTe thin films on CdTe and CdZnTe substrates by atomic force microscopy (AFM) on freshly cleaved (110) crystallographic planes. An empirical observation which may be linked to lattice mismatch was indicated by an angle between the cleavage steps of the substrate to those of the film. The precipitates with size ranging from 5 nm to 20 nm were found to be most apparent near the interface.

  9. Surface structure determinations of crystalline ionic thin films grown on transition metal single crystal surfaces by low energy electron diffraction

    SciTech Connect

    Roberts, Joel Glenn

    2000-05-01

    The surface structures of NaCl(100), LiF(100) and alpha-MgCl2(0001) adsorbed on various metal single crystals have been determined by low energy electron diffraction (LEED). Thin films of these salts were grown on metal substrates by exposing the heated metal surface to a molecular flux of salt emitted from a Knudsen cell. This method of investigating thin films of insulators (ionic salts) on a conducting substrate (metal) circumvents surface charging problems that plagued bulk studies, thereby allowing the use of electron-based techniques to characterize the surface.

  10. Structure and defects of a linear chain polymer film; GeO phthalocyanine epitaxially grown on KC1

    NASA Astrophysics Data System (ADS)

    Kobayashi, Takashi; Uyeda, Natsu

    1987-10-01

    Epitaxial film of GeO phthalocyanine polymer grown on KC1 has been investigated by direct observation of molecular images and electron diffraction. The film is composed of many crystallites oriented in two directions. The mechanism of the epitaxial growth of an organic crystal has been related to the determination of a staggering angle of the molecules stacked in polymer chains. Prominent diffuse scatterings have been observed and their origin has been revealed to be the existence of stacking faults in the crystal. The molecular orientation at the fault is discussed.

  11. Defect study in molecular beam epitaxy-grown HgCdTe films with activated and unactivated arsenic

    SciTech Connect

    Izhnin, I. I.; Dvoretsky, S. A.; Mikhailov, N. N.; Varavin, V. S.; Mynbaev, K. D.; Fitsych, O. I.; Pociask-Bialy, M.; Sheregii, E.; Voitsekhovskii, A. V.

    2014-04-28

    A defect study was performed on molecular beam epitaxy-grown HgCdTe films in situ doped with arsenic. Doping was performed from either effusion cell or cracker cell, and studied were both as-grown samples and samples subjected to arsenic activation annealing. Electrical properties of the films were investigated with the use of ion milling as a means of “stirring” defects in the material. As a result of the study, it was confirmed that the most efficient incorporation of electrically active arsenic occurs at the cracking zone temperature of 700 °C. Interaction between arsenic and tellurium during the growth was observed and is discussed in the paper.

  12. Electrical and Optical Studies of Defect Structure of HgCdTe Films Grown by Molecular Beam Epitaxy

    NASA Astrophysics Data System (ADS)

    Świątek, Z.; Ozga, P.; Izhnin, I. I.; Fitsych, E. I.; Voitsekhovskii, A. V.; Korotaev, A. G.; Mynbaev, K. D.; Varavin, V. S.; Dvoretsky, S. A.; Mikhailov, N. N.; Yakushev, M. V.; Bonchyk, A. Yu.; Savytsky, H. V.

    2016-07-01

    Electrical and optical studies of defect structure of HgCdTe films grown by molecular beam epitaxy (MBE) are performed. It is shown that the peculiarity of these films is the presence of neutral defects formed at the growth stage and inherent to the material grown by MBE. It is assumed that these neutral defects are the Te nanocomplexes. Under ion milling, they are activated by mercury interstitials and form the donor centers with the concentration of 1017 cm-3, which makes it possible to detect such defects by measurements of electrical parameters of the material. Under doping of HgCdTe with arsenic using high temperature cracking, the As2 dimers are present in the arsenic flow and block the neutral Te nanocomplexes to form donor As2Te3 complexes. The results of electrical studies are compared with the results of studies carried out by micro-Raman spectroscopy.

  13. Anomalous Mn depth profiles for GaMnAs/GaAs(001) thin films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Xu, J. F.; Thibado, P. M.; Awo-Affouda, C.; Ramos, F.; Labella, V. P.

    Mn concentration depth profiles in Mn-doped GaAs thin films grown at substrate temperatures of 580 and 250 {\\deg}C using various Mn cell temperatures have been investigated with dynamic secondary ion mass spectrometry and Auger electron spectroscopy. When the samples are grown at a low substrate temperature of 250 {\\deg}C, the Mn distributes uniformly. For the samples grown at a high substrate temperature of 580 {\\deg}C, the concentration depth profiles are easily fitted with a temperature-dependent Fermi function only if the Mn concentration is above the solubility limit. However, when the Mn concentration is below the solubility limit, unexpected peaks are observed in the concentration depth profiles.

  14. Stoichiometry of LaAlO3 films grown on SrTiO3 by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Golalikhani, M.; Lei, Q. Y.; Chen, G.; Spanier, J. E.; Ghassemi, H.; Johnson, C. L.; Taheri, M. L.; Xi, X. X.

    2013-07-01

    We have studied the stoichiometry of epitaxial LaAlO3 thin films on SrTiO3 substrate grown by pulsed laser deposition as a function of laser energy density and oxygen pressure during the film growth. Both x-ray diffraction (θ-2θ scan and reciprocal space mapping) and transmission electron microscopy (geometric phase analysis) revealed a change of lattice constant in the film with the distance from the substrate. Combined with composition analysis using x-ray fluorescence we found that the nominal unit-cell volume expanded when the LaAlO3 film was La-rich, but remained near the bulk value when the film was La-poor or stoichiometric. La excess was found in all the films deposited in oxygen pressures lower than 10-2 Torr. We conclude that the discussion of LaAlO3/SrTiO3 interfacial properties should include the effects of cation off-stoichiometry in the LaAlO3 films when the deposition is conducted under low oxygen pressures.

  15. Magnetorefractive effect in the La1-xKxMnO3 thin films grown by MOCVD

    NASA Astrophysics Data System (ADS)

    Sukhorukov, Yu. P.; Telegin, A. V.; Bessonov, V. D.; Gan'shina, E. A.; Kaul', A. R.; Korsakov, I. E.; Perov, N. S.; Fetisov, L. Yu.; Yurasov, A. N.

    2014-10-01

    Thin epitaxial La1-хKхMnO3 films were grown using two-stage procedure. Influence of substitution of La3+ ions with K+ ions on the optical and electrical properties of La1-xKxMnO3 films (х=0.05, 0.10, 0.15 и 0.18) has been studied in detail. A noticeable magnetorefractive effect in the films under study was detected in the infrared range. Magnetorefractive effect as well as transverse magneto-optical Kerr effect and magnetoresistance have the maximum in optimally doped sample with x=0.18 corresponding to the highest Curie temperature. The experimental data for compositions close to optimally doped films are in good agreement with the data calculated in the framework of a theory developed for manganites. The resonance-like contribution to magnetoreflection spectra of manganite films has been observed in the vicinity of the phonon bands. It is shown that magnetic and charge inhomogeneities strongly influence on the magneto-optical effects in films. Thin films of La1-xKxMnO3 with the large values of Kerr and magnetorefractive effect are promising magneto-optical material in the infrared range.

  16. Physical properties and surface/interface analysis of nanocrystalline WO3 films grown under variable oxygen gas flow rates

    SciTech Connect

    Vemuri, R. S.; Carbjal-Franco, G.; Ferrer, D. A.; Engelhard, Mark H.; Ramana, Chintalapalle V.

    2012-10-15

    Nanocrystalline WO3 films were grown by reactive magnetron sputter-deposition in a wide range of oxygen gas flow rates while keeping the deposition temperature fixed at 400 oC. The physical characteristics of WO3 films were evaluated using grazing incidence X-ray diffraction (GIXRD), X-ray reflectivity (XRR) and transmission electron microscopy (TEM) measurements. Physical characterization indicates that the thickness, grain size, and density of WO3 films are sensitive to the oxygen gas flow rate during deposition. XRD data indicates the formation of tetragonal WO3 films. The grain size increases from 21 to 25 nm with increasing oxygen gas flow rate to 65%, at which point the grain size exhibits a decreasing trend to attain the lowest value of 15 nm at 100% oxygen. TEM analysis provides a model consisting of isotropic WO3 film (nanocrystalline)-SiO2 interface (amorphous)-Si(100) substrate. XRR simulations, which are based on this model, provide excellent agreement to the experimental data indicating that the normalized thickness of WO3 films decreases with the increasing oxygen gas flow rate. The density of WO3 films increases with increasing oxygen gas flow rate.

  17. Effect of substrate temperature on the structure of amorphous oxygenated hydrocarbon films grown with a pulsed supersonic methane plasma flow

    NASA Astrophysics Data System (ADS)

    Fedoseeva, Yu. V.; Pozdnyakov, G. A.; Okotrub, A. V.; Kanygin, M. A.; Nastaushev, Yu. V.; Vilkov, O. Y.; Bulusheva, L. G.

    2016-11-01

    Since amorphous oxygenated hydrocarbon (COxHy) films are promising engineering materials a study of the structure and composition of the films depending on the conditions of synthesis is important for controlling of their physicochemical properties. Here, we used the methods of scanning and transmission electron microscopy, X-ray photoelectron, near-edge X-ray absorption fine structure, Fourier transform infrared and Raman spectroscopy to reveal changes in the chemical connectivity of COxHy films grown on silicon substrates heated to 300, 500, and 700 °C using a supersonic flow of methane plasma. It was found that the COxHy films, deposited at 300 and 500 °C, were mainly composed of the sp2-hybridized carbon areas with various oxygen species. A rise of the substrate temperature caused an increase of the portion of tetrahedral carbon atoms as well as carboxyl and hydroxyl groups. With growth of the substrate temperature, the film thickness reduced monotonically from 400 to 180 nm, while the film adhesion improved substantially. The films, deposited at lower temperatures, showed high hydrophilicity due to porosity and presence of oxygenated groups both at the surface and in the bulk.

  18. Substrate dependent structural, optical and electrical properties of ZnS thin films grown by RF sputtering

    NASA Astrophysics Data System (ADS)

    Pathak, Trilok K.; Kumar, Vinod; Purohit, L. P.; Swart, H. C.; Kroon, R. E.

    2016-10-01

    Zinc sulphide (ZnS) films are of great importance for applications in various optoelectronic devices. ZnS thin films were grown on glass, indium tin oxide (ITO) and Corning glass substrates by radio-frequency magnetron sputtering at a temperature of 373 K and a comparative study of the structural, optical and electrical properties was performed using X-ray diffraction (XRD), scanning electron microscopy, optical and current-voltage (I-V) measurements. The XRD patterns showed that the sputtered thin films exhibited good crystallinity with the (111) peak around 2θ=28.3° indicating preferential orientation of the cubic structure. The maximum strain and most densely packed grains were obtained for the Corning glass substrate. The transmittance spectra of the films were measured in the wavelength range from 200 to 800 nm, showing that the films are about 77% transparent in the visible region. A slight change of 3.50 eV to 3.54 eV was found for the bandgap of the films deposited on different substrates. The ZnS thin films deposited on Corning glass show better crystallinity, morphology and I-V characteristics than that deposited on ordinary glass and ITO substrates.

  19. Effects of post-deposition annealing on the structure and magnetization of PLD grown yttrium iron garnet films

    NASA Astrophysics Data System (ADS)

    Kumar, Ravinder; Hossain, Z.; Budhani, R. C.

    2017-03-01

    We report on the recrystallization of 200 nm thick as-grown Yttrium Iron Garnet ( Y 3.4 Fe 4.6 O 12 ) films on the (111) face of gadolinium gallium garnet single crystals by post-deposition annealing. Epitaxial conversion of the as-grown microcrystalline yttrium iron garnet films was seen after annealing at 800 °C for more than 30 min both in ambient oxygen and in air. The as-grown oxygen annealed samples at 800 °C for 60 min crystallize epitaxially and show excellent figure-of-merit for saturation magnetization (MS = 3.3 μB/f.u., comparable to the bulk value) and coercivity (HC ˜ 1.1 Oe). The ambient air annealing at 800 °C with a very slow rate of cooling (2 °C/min) results in a double layer structure with a thicker unstrained epitaxial top layer having the MS and HC of 2.9 μB/f.u. and 0.12 Oe, respectively. The symmetric and asymmetric reciprocal space maps of both the samples reveal a locking of the in-plane lattice of the film to the in-plane lattice of the substrate, indicating a pseudomorphic growth. The residual stress calculated by the sin 2 ψ technique is compressive in nature. The lower layer in the air annealed sample is highly strained, whereas the top layer has negligible compressive stress.

  20. Refractive index and interband transitions in strain modified NaNbO3 thin films grown by MOCVD

    NASA Astrophysics Data System (ADS)

    Anooz, S. Bin; Petrik, P.; Schmidbauer, M.; Remmele, T.; Schwarzkopf, J.

    2015-09-01

    The influence of lattice strain on the refractive index and optical band gap of NaNbO3 thin films, deposited by the liquid-delivery spin metalorganic chemical vapor deposition method, was investigated by spectroscopic ellipsometry. Epitaxial growth of coherently strained NaNbO3 films was confirmed by high-resolution x-ray diffraction and transmission electron microscopy. Incorporated lattice strain in the films was varied by the use of the oxide substrates NdGaO3, SrTiO3 and DyScO3, which exhibit lattice mismatches to NaNbO3 with different sign, magnitude and anisotropy. The Sellmeier dispersion was employed to analyze the ellipsometry data in energy region of 1.49-2.75 eV. The refractive index at 632.8 nm of the pseudomorphically grown NaNbO3 films critically depends on the incorporated elastic lattice strain and results in a continuous decrease from 2.46 to 2.18 by varying the in-plane strain from compressive to tensile. Band gap energies for films grown under compressive and tensile lattice strain were determined by collecting spectroscopic ellipsometry data in a larger energy range between 0.73-6.48 eV and evaluating them by the Tauc-Lorentz dispersion. We observed that for tensily strained NaNbO3 films deposited on DyScO3 and SrTiO3, the band gap energies increased to 3.60+/- 0.01 and 3.64+/- 0.02 eV, respectively. For the compressively strained NaNbO3 film deposited on NdGaO3 the band gap is shifted to still higher energies (3.80+/- 0.01 eV).

  1. Martensitic transformation in as-grown and annealed near-stoichiometric epitaxial Ni2MnGa thin films

    NASA Astrophysics Data System (ADS)

    Machain, P.; Condó, A. M.; Domenichini, P.; Pozo López, G.; Sirena, M.; Correa, V. F.; Haberkorn, N.

    2015-08-01

    Magnetic shape memory nanostructures have a great potential in the field of the nanoactuators. The relationship between dimensionality, microstructure and magnetism characterizes the materials performance. Here, we study the martensitic transformation in supported and free-standing epitaxial Ni47Mn24Ga29 films grown by sputtering on (0 0 1) MgO using a stoichiometric Ni2MnGa target. The films have a Curie temperature of ~390 K and a martensitic transition temperature of ~120 K. Similar transition temperatures have been observed in films with thicknesses of 1, 3 and 4 μm. Thicker films (with longer deposition time) present a wider martensitic transformation range that can be associated with small gradients in their chemical concentration due to the high vapour pressure of Mn and Ga. The magnetic anisotropy of the films shows a strong change below the martensitic transformation temperature. No features associated with variant reorientation induced by magnetic field have been observed. Annealed films in the presence of a Ni2MnGa bulk reference change their chemical composition to Ni49Mn26Ga25. The change in the chemical composition increases the martensitic transformation temperature, being closer to the stoichiometric compound, and reduces the transformation hysteresis. In addition, sharper transformations are obtained, which indicate that chemical inhomogeneities and defects are removed. Our results indicate that the properties of Ni-Mn-Ga thin films grown by sputtering can be optimized (fixing the chemical concentration and removing crystalline defects) by the annealing process, which is promising for the development of micromagnetic shape memory devices.

  2. Structure property relationships in gallium oxide thin films grown by pulsed laser deposition [Structure property relationships in Ga2O3 thin films grown by pulsed laser deposition

    DOE PAGES

    Garten, Lauren M.; Zakutayev, Andriy; Perkins, John D.; ...

    2016-11-21

    Beta-gallium oxide (β-Ga2O3) is of increasing interest to the optoelectronic community for transparent conductor and power electronic applications. Considerable variability exists in the literature on the growth and doping of Ga2O3 films, especially as a function of growth approach, temperature, and oxygen partial pressure. Here pulsed laser deposition (PLD) was used to grow high-quality β-Ga2O3 films on (0001) sapphire and (–201) Ga2O3 single crystals and to explore the growth, stability, and dopability of these films as function of temperature and oxygen partial pressure. As a result, there is a strong temperature dependence to the phase formation, morphology, and electronic propertiesmore » of β-Ga2O3 from 350 to 550 °C.« less

  3. XPS Depth Profile Analysis of Zn3N2 Thin Films Grown at Different N2/Ar Gas Flow Rates by RF Magnetron Sputtering

    NASA Astrophysics Data System (ADS)

    Haider, M. Baseer

    2017-01-01

    Zinc nitride thin films were grown on fused silica substrates at 300 °C by radio frequency magnetron sputtering. Films were grown at different N2/Ar flow rate ratios of 0.20, 0.40, 0.60, 0.80, and 1.0. All the samples have grain-like surface morphology with an average surface roughness ranging from 4 to 5 nm and an average grain size ranging from 13 to16 nm. Zn3N2 samples grown at lower N2/Ar ratio are polycrystalline with secondary phases of ZnO present, whereas at higher N2/Ar ratio, no ZnO phases were found. Highly aligned films were achieved at N2/Ar ratio of 0.60. Hall effect measurements reveal that films are n-type semiconductors, and the highest carrier concentration and Hall mobility was achieved for the films grown at N2/Ar ratio of 0.60. X-ray photoelectron study was performed to confirm the formation of Zn-N bonds and to study the presence of different species in the film. Depth profile XPS analyses of the films reveal that there is less nitrogen in the bulk of the film compared to the nitrogen on the surface of the film whereas more oxygen is present in the bulk of the films possibly occupying the nitrogen vacancies.

  4. XPS Depth Profile Analysis of Zn3N2 Thin Films Grown at Different N2/Ar Gas Flow Rates by RF Magnetron Sputtering.

    PubMed

    Haider, M Baseer

    2017-12-01

    Zinc nitride thin films were grown on fused silica substrates at 300 °C by radio frequency magnetron sputtering. Films were grown at different N2/Ar flow rate ratios of 0.20, 0.40, 0.60, 0.80, and 1.0. All the samples have grain-like surface morphology with an average surface roughness ranging from 4 to 5 nm and an average grain size ranging from 13 to16 nm. Zn3N2 samples grown at lower N2/Ar ratio are polycrystalline with secondary phases of ZnO present, whereas at higher N2/Ar ratio, no ZnO phases were found. Highly aligned films were achieved at N2/Ar ratio of 0.60. Hall effect measurements reveal that films are n-type semiconductors, and the highest carrier concentration and Hall mobility was achieved for the films grown at N2/Ar ratio of 0.60. X-ray photoelectron study was performed to confirm the formation of Zn-N bonds and to study the presence of different species in the film. Depth profile XPS analyses of the films reveal that there is less nitrogen in the bulk of the film compared to the nitrogen on the surface of the film whereas more oxygen is present in the bulk of the films possibly occupying the nitrogen vacancies.

  5. Status of ferrite technology for high volume microwave applications

    SciTech Connect

    Webb, D.C.

    1995-08-01

    With the emergence of high volume commercial and military applications, there is a growing need to reduce the size and cost of microwave ferrite components, especially ferrite circulators, to be more compatible with monolithic integrated circuits. The Ferrite Development Consortium, consisting of leading US ferrite government, university and industrial institutions, was formed under Advanced Research Project Agency (ARPA) sponsorship to address these needs. Areas of Consortium technical activity include bulk and thick-film techniques for batch processing of ferrite devices, improved computer-aided-design tools and protype demonstrations. This paper will review the Consortium`s materials development needs and progress.

  6. Stabilization of scandium rich spinel ferrite CoFe{sub 2−x}Sc{sub x}O{sub 4} (x≤1) in thin films

    SciTech Connect

    Lefevre, Christophe Roulland, François; Thomasson, Alexandre; Autissier, Emmanuel; Leuvrey, Cédric; Barre, Sophie; Versini, Gilles; Viart, Nathalie; Pourroy, Geneviève

    2015-12-15

    Scandium rich cobalt ferrites Co{sub y}Fe{sub 3−x−y}Sc{sub x}O{sub 4} with y~1 never obtained in bulk could be stabilized in pulsed laser deposited thin films. Scandium contents of up to x=1 are reached. The cell parameter increases versus x as awaited when considering the size of scandium. It is equal to 0.8620 nm for x=1, significantly higher than that of CoFe{sub 2}O{sub 4} (0.8396 nm). The lattice mismatch between the MgO (100) substrate and the scandium-containing spinel leads to an increased roughness. Cobalt is displaced from the octahedral site by Sc and mainly occupies the tetrahedral sites for high x values. - Graphical abstract: Magnification of the XRD patterns recorded on thin films of CoFe{sub 2-x}Sc{sub x}O{sub 4} for x=0, 0.45, 1 and 1.2, the arrows denote the (004) and (008) diffraction lines of the spinel phase.

  7. Unpredicted surface termination of α-Fe2O3(0001) film grown by mist chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Osaka, Shun; Kubo, Osamu; Takahashi, Kazuki; Oda, Masaya; Kaneko, Kentaro; Tabata, Hiroshi; Fujita, Shizuo; Katayama, Mitsuhiro

    2017-06-01

    We analyze the surface structure of an α-Fe2O3(0001) film grown on a c-plane sapphire substrate by mist chemical vapor deposition (CVD), which has been recently developed as a simple, safe, and cost-effective film growth method. Using coaxial impact-collision ion scattering spectroscopy, we found that the atomic-layer sequence of the surface termination of an α-Fe2O3(0001) film grown by mist CVD was Fe-O3-Fe- from the top layer. This surface termination is predicted to form in an oxygen-poor environment by density functional theory combined with a thermodynamical approach despite that the mist CVD process is performed with atmospheric-pressure air. The surface structure markedly changes after annealing above 600 °C in ultrahigh vacuum. We found that only a couple of layers from the top layer transform into Fe3O4(111) after 650 °C annealing, which would be so-called biphase reconstruction. Complete transformation into a Fe3O4(111) film occurs at 700 °C, whose atomic-layer sequence is determined to be Fe-O4-Fe3- from the top layer.

  8. Surface morphology and lattice misfit in YIG and La:YIG films grown by LPE method on GGG substrate

    SciTech Connect

    Choi, D.Y.; Chung, S.J.

    1998-12-31

    Y{sub 3}Fe{sub 5}O{sub 12}(YIG) and La-doped YIG films were grown on the (111) GGG substrate using the PbO-B{sub 2}O{sub 3} flux system. Pb, La incorporation and lattice misfit and annealing behaviors were studied. In the case of LPE growth of YIG film, lead ions from flux are substituted inevitably, and they play an important role in controlling film misfit. For a complete lattice matching, high supercooling is necessary in pure YIG growth, but this induces high defect concentration. In this experiment, La ions were added in the solution to sufficiently increase lattice parameter of the film grown under low supercooling. The concentration of substituted Pb and La were increased as the growth temperature was lowered and growth rate increased. The effective distribution coefficient of La was about 0.2 at a supercooling of 30 C. The optimum growth conditions which bring about very small misfit were determined by measuring the misfit by double crystal diffractometer. Strain distributions of pre-annealed and annealed samples were investigated by triple crystal diffractometer.

  9. Semiconductor-insulator transition in VO{sub 2} (B) thin films grown by pulsed laser deposition

    SciTech Connect

    Rúa, Armando; Díaz, Ramón D.; Lysenko, Sergiy; Fernández, Félix E.

    2015-09-28

    Thin films of B-phase VO{sub 2} were grown by pulsed-laser deposition on glass and (100)-cut MgO substrates in a temperature range from 375 to 425 °C and at higher gas pressures than usual for this technique. The films were strongly oriented, with ab-planes parallel to the substrate surface. Detailed study of surface morphology through Atomic Force Microscopy images suggest significant differences in evolution as a function of growth temperature for films on the two types of substrates. Measurements of electrical conductivities through cooling-heating cycles from room temperature to 120 K showed changes of five orders of magnitude, with steeper changes between room temperature and ∼150 K, which corresponds with the extended and reversible phase transition known to occur for this material. At lower temperatures conductivities exhibited Arrhenius behavior, indicating that no further structural change was occurring and that conduction is thermally activated. In this lower temperature range, conductivity of the samples can be described by the near-neighbor hopping model. No hysteresis was found between the cooling and heating braches of the cycles, which is at variance with previous results published for VO{sub 2} (B). This apparent lack of hysteresis for thin films grown in the manner described and the large conductivity variation as a function of temperature observed for the samples suggests this material could be of interest for infrared sensing applications.

  10. Stoichiometric, nonstoichiometric, and locally nonstoichiometric SrTiO{sub 3} films grown by molecular beam epitaxy

    SciTech Connect

    Fisher, P.; Du, H.; Skowronski, M.; Salvador, P. A.; Maksimov, O.; Weng, X.

    2008-01-01

    SrTiO{sub 3} films were grown by reactive molecular beam epitaxy to have varying degrees of both global and local cationic nonstoichiometries (with stoichiometry defined as a 1:1 ratio of Sr:Ti). Slight global excesses of Sr and Ti resulted in two-fold reconstructions in the reflection high-energy electron diffraction patterns along the [110] and [100] azimuths, respectively. Larger global nonstoichiometries (2:1 and 1:2 ratios) were also accommodated into the film's crystalline structure and affected the long-range crystalline order as observed in the x-ray diffraction patterns, both of which were related to the parent perovskite pattern. Local nonstoichiometries were introduced by depositing multiple monolayers (MLs) (from 2 to 33) of SrO and TiO{sub 2} in an alternating fashion, while maintaining the global SrTiO{sub 3} stoichiometry. These layered structures of SrO and TiO{sub 2} blocks inter-reacted during growth to form highly crystalline epitaxial SrTiO{sub 3}. Films grown in this manner with blocks thicker than 8 MLs were fully relaxed and, when the block thicknesses ranged between 8 and 10 MLs, the full widths at half maxima of 2{theta} peaks were narrower than the standard SrTiO{sub 3} films having blocks 1 ML thick.

  11. Investigation of the optimal annealing temperature for the enhanced thermoelectric properties of MOCVD-grown ZnO films

    NASA Astrophysics Data System (ADS)

    Mahmood, K.; Ali, A.; Arshad, M. I.; Ajaz un Nabi, M.; Amin, N.; Faraz Murtaza, S.; Rabia, S.; Azhar Khan, M.

    2017-04-01

    In this study, we demonstrate the optimization of the annealing temperature for enhanced thermoelectric properties of ZnO. Thin films of ZnO are grown on a sapphire substrate using the metal organic chemical Vapor Deposition (MOCVD) technique. The grown films are annealed in an oxygen environment at 600-1000°C, with a step of 100°C for one hour. Seebeck measurements at room temperature revealed that the Seebeck coefficient of the sample that was not annealed was 152 μV/K, having a carrier concentration of N D 1.46 × 1018 cm-3. The Seebeck coefficient of the annealed films increased from 212 to 415 μV/K up to 900°C and then decreased at 1000°C. The power factor is calculated and found to have an increasing trend with the annealing temperature. This observation is explained by the theory of Johnson and Lark-Horovitz that thermoelectric properties are enhanced by improving the structure of ZnO thin films. The Hall measurements and PL data strongly justify the proposed argument.

  12. KCl ultra-thin films with polar and non-polar surfaces grown on Si(111)7 × 7

    PubMed Central

    Beinik, Igor; Barth, Clemens; Hanbücken, Margrit; Masson, Laurence

    2015-01-01

    The growth of ultra-thin KCl films on the Si(111)7 × 7 reconstructed surface has been investigated as a function of KCl coverage and substrate temperature. The structure and morphology of the films were characterized by means of scanning tunneling microscopy (STM) under ultra-high vacuum (UHV) conditions. Detailed analysis of the atomically resolved STM images of islands grown at room and high temperatures (400 K–430 K) revealed the presence of KCl(001) and KCl(111) islands with the ratio between both structures depending on the growth temperature. At room temperature, the growth of the first layer, which covers the initial Si(111)7 × 7 surface, contains double/triple atomic layers of KCl(001) with a small fraction of KCl(111) islands. The high temperature growth promotes the appearance of large KCl(111) areas, which are built up by three atomic layers. At room and high temperatures, flat and atomically well-defined ultra-thin KCl films can be grown on the Si(111)7 × 7 substrate. The formation of the above mentioned (111) polar films is interpreted as a result of the thermally activated dissociative adsorption of KCl molecules on Si(111)7 × 7, which produces an excess of potassium on the Si surface. PMID:25650038

  13. Effect of RF power density on micro- and macro-structural properties of PECVD grown hydrogenated nanocrystalline silicon thin films

    SciTech Connect

    Gokdogan, Gozde Kahriman; Anutgan, Tamila

    2016-03-25

    This contribution provides the comparison between micro- and macro-structure of hydrogenated nanocrystalline silicon (nc-Si:H) thin films grown by plasma enhanced chemical vapor deposition (PECVD) technique under different RF power densities (P{sub RF}: 100−444 mW/cm{sup 2}). Micro-structure is assessed through grazing angle X-ray diffraction (GAXRD), while macro-structure is followed by surface and cross-sectional morphology via field emission scanning electron microscopy (FE-SEM). The nanocrystallite size (∼5 nm) and FE-SEM surface conglomerate size (∼40 nm) decreases with increasing P{sub RF}, crystalline volume fraction reaches maximum at 162 mW/cm{sup 2}, FE-SEM cross-sectional structure is columnar except for the film grown at 162 mW/cm{sup 2}. The dependence of previously determined ‘oxygen content–refractive index’ correlation on obtained macro-structure is investigated. Also, the effect of P{sub RF} is discussed in the light of plasma parameters during film deposition process and nc-Si:H film growth models.

  14. Microstructural Properties of NC-Si/SiO2 Films IN SITU Grown by Reactive Magnetron Co-Sputtering

    NASA Astrophysics Data System (ADS)

    Lu, Wanbing; Guo, Shaogang; Wang, Jiantao; Li, Yun; Wang, Xinzhan; Yu, Gengxi; Fan, Shanshan; Fu, Guangsheng

    2012-01-01

    Nanocrystalline silicon embedded in silicon oxide (nc-Si/SiO2) films have been in situ grown at a low substrate temperature of 300°C by reactive magnetron co-sputtering of Si and SiO2 targets in a mixed Ar/H2 discharge. The influences of H2 flow rate (FH) on the microstructural properties of the deposited nc-Si/SiO2 films were investigated. The results of XRD and the deposition rate of nc-Si/SiO2 films show that the introduction of H2 contributes to the growth of nc-Si grains in silicon oxide matrix. With further increasing FH, the average size of nc-Si grains increases and the deposition rate of nc-Si/SiO2 films decreases gradually. Fourier transform infrared spectra analyses reveal that introduction of hydrogen contributes to the phase separation of nc-Si and SiOx in the deposited films. Moreover, the Si-O4-nSin(n = 0, 1) concentration of the deposited nc-Si/SiO2 films reduces with the increase of FH, while that of Si-O4-nSin(n = 2, 3) concentration increases. These results can be explained by that active hydrogen atoms increase the probability of reducing oxygen from precursor in the plasma and prompting oxygen desorption from the growing surface. This low-temperature procedure for preparing nc-Si/SiO2 films opens up the possibility of fabricating the silicon-based thin-film solar cells onto low-cost glass substrates using nc-Si/SiO2 films.

  15. On the radiation hardness of (Mg,Zn)O thin films grown by pulsed-laser deposition

    SciTech Connect

    Schmidt, Florian; Wenckstern, Holger von; Spemann, Daniel; Grundmann, Marius

    2012-07-02

    We report on electrical properties and the generation of the E4 defect in pulsed-laser deposited Mg{sub x}Zn{sub 1-x}O thin films irradiated with 2.25 MeV protons. Whereas the electrical properties of the Schottky diodes as well as the net doping density of the samples did not change due to irradiation, the concentration of the E4 defect increased proportional to the applied dose as revealed by deep level transient spectroscopy. The generation rate {eta}, is for binary ZnO thin films about 40 cm{sup -1}, a factor of 3 higher than in melt-grown single crystals, and increases to about 100 cm{sup -1} for the Mg-alloyed thin films.

  16. Morphology of TiN thin films grown on MgO(001) by reactive dc magnetron sputtering

    SciTech Connect

    Ingason, A. S.; Magnus, F.; Olafsson, S.; Gudmundsson, J. T.

    2010-07-15

    Thin TiN films were grown by reactive dc magnetron sputtering on single-crystalline MgO(001) substrates at a range of temperatures from room temperature to 600 deg. C. Structural characterization was carried out using x-ray diffraction and reflection methods. TiN films grow epitaxially on the MgO substrates at growth temperatures of 200 deg. C and above. The crystal coherence length determined from Laue oscillations and the Scherrer method agrees with x-ray reflection thickness measurements to 6% and within 3% for growth temperatures of 200 and 600 deg. C, respectively. For lower growth temperatures the films are polycrystalline but highly textured and porous.

  17. Light emission and magnetic properties of aluminum films grown on SrTiO{sub 3} by molecular beam epitaxy

    SciTech Connect

    Wang, Y. J.; Zhou, W. Q.; Meng, M.; Wu, S. X.; Li, S. W.

    2016-06-15

    Aluminum films were grown on SrTiO{sub 3} (100) substrates using a plasma-assisted molecular beam epitaxy system. We found that the intensity of defect emission coming through the Al films was enhanced to two fold. Although the surface plasmon energy is far from the defect emission, off-resonance enhancement is still possible from Al/SrTiO{sub 3}. Moreover, the samples with Al films exhibits ferromagnetism, with wasp-waist hysteresis loops and exchange bias effects. The ferromagnetism may be attributed to the charge transfer between Al and the SrTiO{sub 3} matrix. This work is valuable in developing SrTiO{sub 3} which is a promising material used in optical and magnetic related application.

  18. AlN thin films grown on epitaxial 3C-SiC (100) for piezoelectric resonant devices

    SciTech Connect

    Lin, Chih-Ming; Senesky, Debbie G.; Pisano, Albert P.; Lien, Wei-Cheng; Felmetsger, Valery V.; Hopcroft, Matthew A.

    2010-10-04

    Highly c-axis oriented heteroepitaxial aluminum nitride (AlN) films were grown on epitaxial cubic silicon carbide (3C-SiC) layers on Si (100) substrates using alternating current reactive magnetron sputtering at temperatures between approximately 300-450 deg. C. The AlN films were characterized by x-ray diffraction, scanning electron microscope, and transmission electron microscopy. A two-port surface acoustic wave device was fabricated on the AlN/3C-SiC/Si composite structure, and an expected Rayleigh mode exhibited a high acoustic velocity of 5200 m/s. The results demonstrate the potential of utilizing AlN films on epitaxial 3C-SiC layers to create piezoelectric resonant devices.

  19. Dislocation densities reduction in MBE-grown AlN thin films by high-temperature annealing

    NASA Astrophysics Data System (ADS)

    Nemoz, Maud; Dagher, Roy; Matta, Samuel; Michon, Adrien; Vennéguès, Philippe; Brault, Julien

    2017-03-01

    AlN thin films, grown on (0001) sapphire substrates by molecular beam epitaxy (MBE), were annealed at high temperature (up to 1650 °C) in flowing N2. X-ray diffraction (XRD) studies, combined with Williamson-Hall and Srikant plots, have shown that annealing leads to a strong reduction of both edge and mixed threading dislocation densities, as confirmed by transmission electron microscopy (TEM) images, up to 75%. Moreover, it is found that annealing at high temperatures allows the relaxation of the tensile strain in the AlN film due to the growth process. In addition, the morphological properties of the films were determined by atomic force microscopy (AFM) and show that the annealing conditions have a strong impact on the surface morphology and roughness. Finally, an annealing at 1550 °C for 20 min appears as an ideal tradeoff to enhance the structural properties while preserving the initial AlN surface morphology.

  20. Hardness, elastic modulus, and wear resistance of hafnium oxide-based films grown by atomic layer deposition

    SciTech Connect

    Berdova, Maria; Liu, Xuwen; Franssila, Sami; Wiemer, Claudia; Lamperti, Alessio; Tallarida, Grazia; Cianci, Elena; Fanciulli, Marco

    2016-09-15

    The investigation of mechanical properties of atomic layer deposition HfO{sub 2} films is important for implementing these layers in microdevices. The mechanical properties of films change as a function of composition and structure, which accordingly vary with deposition temperature and post-annealing. This work describes elastic modulus, hardness, and wear resistance of as-grown and annealed HfO{sub 2}. From nanoindentation measurements, the elastic modulus and hardness remained relatively stable in the range of 163–165 GPa and 8.3–9.7 GPa as a function of deposition temperature. The annealing of HfO{sub 2} caused significant increase in hardness up to 14.4 GPa due to film crystallization and densification. The structural change also caused increase in the elastic modulus up to 197 GPa. Wear resistance did not change as a function of deposition temperature, but improved upon annealing.

  1. Role of native defects in nitrogen flux dependent carrier concentration of InN films grown by molecular beam epitaxy

    SciTech Connect

    Tangi, Malleswararao; Kuyyalil, Jithesh; Shivaprasad, S. M.

    2012-10-01

    We address the carrier concentration, strain, and bandgap issue of InN films grown on c-sapphire at different N-flux by molecular beam epitaxy using x-ray diffraction and x-ray photoelectron spectroscopy. We demonstrate that the strain in InN films arises due to point defects like nitrogen interstitials and nitrogen antisites. We report minimal biaxial strain due to relaxed growth morphology and a minimal hydrostatic strain arising due to interstitial nitrogen atoms being partially compensated by nitrogen antisites. We find that the variation in absorption edge can be attributed to defect induced carrier concentration and that nitrogen interstitials and nitrogen antisites act as donors that yield the respective absorption edge and Moss-Burstein shift. Our studies are a step towards the ability to form low carrier concentration strain-relaxed films and to determine the intrinsic band gap value for this technologically important material.

  2. Magnetic properties of low-moment ferrimagnetic Heusler Cr 2 CoGa thin films grown by molecular beam epitaxy

    DOE PAGES

    Jamer, Michelle E.; Sterbinsky, George E.; Stephen, Gregory M.; ...

    2016-10-31

    Recently, theorists have predicted many materials with a low magnetic moment and large spin-polarization for spintronic applications. These compounds are predicted to form in the inverse Heusler structure; however, many of these compounds have been found to phase segregate. In this study, ordered Cr2CoGa thin films were synthesized without phase segregation using molecular beam epitaxy. The present as-grown films exhibit a low magnetic moment from antiferromagnetically coupled Cr and Co atoms as measured with superconducting quantum interface device magnetometry and soft X-ray magnetic circular dichroism. Electrical measurements demonstrated a thermally-activated semiconductor-like resistivity component with an activation energy of 87 meV.more » These results confirm spin gapless semiconducting behavior, which makes these thin films well positioned for future devices.« less

  3. Correlation of nanochemistry and electrical properties in HfO2 films grown by metalorganic molecular-beam epitaxy

    NASA Astrophysics Data System (ADS)

    Moon, Tae-Hyoung; Ham, Moon-Ho; Myoung, Jae-Min

    2005-03-01

    We present the annealing effects on nanochemistry and electrical properties in HfO2 dielectrics grown by metalorganic molecular-beam epitaxy. After the postannealing treatment of HfO2 films in the temperature range of 600-800°C, the thicknesses and chemical states of the films were examined by high-resolution transmission electron microscopy and angle-resolved x-ray photoelectron spectroscopy. By comparing the line shapes of core-level spectra for the samples with different annealing temperatures, the concentrations of SiO and Hf-silicate with high dielectric constant are found to be highest for HfO2 film annealed at 700°C. This result supports that the accumulation capacitance of the sample annealed at 700°C is not deteriorated in spite of a steep increase in interfacial layer thickness compared with that of the sample annealed at 600°C.

  4. A study on the epitaxial Bi{sub 2}Se{sub 3} thin film grown by vapor phase epitaxy

    SciTech Connect

    Lin, Yen-Cheng; Chen, Yu-Sung; Lee, Chao-Chun; Wu, Jen-Kai; Lee, Hsin-Yen E-mail: hyli@ntu.edu.tw; Liang, Chi-Te; Chang, Yuan Huei E-mail: hyli@ntu.edu.tw

    2016-06-15

    We report the growth of high quality Bi{sub 2}Se{sub 3} thin films on Al{sub 2}O{sub 3} substrates by using chemical vapor deposition. From the atomic force microscope, x-ray diffraction and transmission electron microscope measurements we found that the films are of good crystalline quality, have two distinct domains and can be grown epitaxially on the Al{sub 2}O{sub 3} substrate. Carrier concentration in the sample is found to be 1.1 × 10{sup 19} cm{sup −3} between T = 2 K to T = 300 K, and electron mobility can reach 954 cm{sup 2}/V s at T = 2 K. Weak anti-localization effect is observed in the low temperature magneto-transport measurement for the sample which indicates that the thin film has topological surface state.

  5. High indium content InGaN films grown by pulsed laser deposition using a dual-compositing target.

    PubMed

    Shen, Kun-Ching; Wang, Tzu-Yu; Wuu, Dong-Sing; Horng, Ray-Hua

    2012-07-02

    High indium compositions InGaN films were grown on sapphires using low temperature pulse laser deposition (PLD) with a dual-compositing target. This target was used to overcome the obstacle in the InGaN growth by PLD due to the difficulty of target preparation, and provided a co-deposition reaction, where InGaN grains generated from the indium and GaN vapors deposit on sapphire surface and then act as nucleation seeds to promote further InGaN growth. The effects of co-deposition on growth mechanisms, surface morphology, and electrical properties of films were thoroughly investigated and the results clearly show promise for the development of high indium InGaN films using PLD technique with dual-compositing targets.

  6. The depth-profiled carrier concentration and scattering mechanism in undoped GaN film grown on sapphire

    NASA Astrophysics Data System (ADS)

    Huang, Y.; Chen, X. D.; Fung, S.; Beling, C. D.; Ling, C. C.; Wei, Z. F.; Xu, S. J.; Zhi, C. Y.

    2004-07-01

    Temperature-dependent Hall (TDH) measurements and confocal micro-Raman spectroscopy have been used to study the free carrier spatial distribution and scattering mechanism in unintentionally doped GaN film grown on the sapphire substrate with the method of metalorganic chemical vapor deposition. Both the TDH data and the depth-profiled Raman spectra agreed with the existence of a nonuniform spatial distribution of free carriers in the GaN film with a highly conductive layer of ˜1 μm thickness near the GaN sapphire boundary. With the consideration of this parallel conduction channel adjacent to GaN sapphire boundary, detailed analysis of the TDH mobility data suggests that a relatively high concentration of nitrogen vacancies exists and nitrogen vacancy scattering has an important influence on limiting the electron mobility in the bulk film of the present GaN sample.

  7. Light emission and magnetic properties of aluminum films grown on SrTiO3 by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Wang, Y. J.; Zhou, W. Q.; Meng, M.; Wu, S. X.; Li, S. W.

    2016-06-01

    Aluminum films were grown on SrTiO3 (100) substrates using a plasma-assisted molecular beam epitaxy system. We found that the intensity of defect emission coming through the Al films was enhanced to two fold. Although the surface plasmon energy is far from the defect emission, off-resonance enhancement is still possible from Al/SrTiO3. Moreover, the samples with Al films exhibits ferromagnetism, with wasp-waist hysteresis loops and exchange bias effects. The ferromagnetism may be attributed to the charge transfer between Al and the SrTiO3 matrix. This work is valuable in developing SrTiO3 which is a promising material used in optical and magnetic related application.

  8. Structure and optical band gaps of (Ba,Sr)SnO{sub 3} films grown by molecular beam epitaxy

    SciTech Connect

    Schumann, Timo; Raghavan, Santosh; Ahadi, Kaveh; Kim, Honggyu; Stemmer, Susanne

    2016-09-15

    Epitaxial growth of (Ba{sub x}Sr{sub 1−x})SnO{sub 3} films with 0 ≤ x ≤ 1 using molecular beam epitaxy is reported. It is shown that SrSnO{sub 3} films can be grown coherently strained on closely lattice and symmetry matched PrScO{sub 3} substrates. The evolution of the optical band gap as a function of composition is determined by spectroscopic ellipsometry. The direct band gap monotonously decreases with x from to 4.46 eV (x = 0) to 3.36 eV (x = 1). A large Burnstein-Moss shift is observed with La-doping of BaSnO{sub 3} films. The shift corresponds approximately to the increase in Fermi level and is consistent with the low conduction band mass.

  9. Comparison of morphology evolution of Ge(001) homoepitaxial films grown by pulsed laser deposition and molecular-beam epitaxy

    SciTech Connect

    Shin Byungha; Leonard, John P.; McCamy, James W.; Aziz, Michael J.

    2005-10-31

    Using a dual molecular-beam epitaxy (MBE)-pulsed laser deposition (PLD) ultrahigh vacuum chamber, we have conducted the first experiments under identical thermal, background, and surface preparation conditions to compare Ge(001) homoepitaxial growth morphology in PLD and MBE. We find that in PLD with low kinetic energy and in MBE the film morphology evolves in a similar fashion: initially irregularly shaped mounds form, followed by pyramidal mounds with edges of the square-base along the <100> directions; the film roughness and mound separation increase with film thickness. In PLD with high kinetic energy, well-defined pyramidal mounds are not observed and the morphology rather resembles that of an ion-etched Ge(001) surface. The areal feature density is higher for PLD films than for MBE films grown at the same average growth rate and temperature. Furthermore, the dependence upon film thickness of roughness and feature separation differ for PLD and MBE. We attribute these differences to the higher yield of defect generation by energetic species in PLD.

  10. Fabrication and properties of Sb-doped ZnO thin films grown by radio frequency (RF) magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Wang, Peng; Chen, Nuofu; Yin, Zhigang; Yang, Fei; Peng, Changtao

    2006-04-01

    Sb-doped and undoped ZnO thin films were deposited on Si (1 0 0) substrates by radio frequency (RF) magnetron sputtering. X-ray diffraction (XRD) and scanning electron microscopy (SEM) analyses revealed that all the films had polycrystalline wurtzite structure and c-axis preferred orientation. Room temperature Hall measurements showed that the as-grown films were n-type and conducting ( ρ˜1-10 Ω cm). Annealing in a nitrogen ambient at 400 °C for 1 h made both samples highly resistive ( ρ>10 3 Ω cm). Increasing the annealing temperature up to 800 °C, the resistivity of the undoped ZnO film decreased gradually, but it increased for the Sb-doped ZnO film. In the end, the Sb-doped ZnO film annealed at 800 °C became semi-insulating with a resistivity of 10 4 Ω cm. In addition, the effects of annealing treatment and Sb-doping on the structural and electrical properties are discussed.

  11. Magnetic properties of Sm-Co thin films grown on MgO(100) deposited from a single alloy target

    SciTech Connect

    Verhagen, T. G. A.; Boltje, D. B.; Ruitenbeek, J. M. van; Aarts, J.

    2014-08-07

    We have grown epitaxial Sm-Co thin films by sputter deposition from a single alloy target with a nominal SmCo{sub 5} composition on Cr(100)-buffered MgO(100) single-crystal substrates. By varying the Ar gas pressure, we can change the composition of the film from a SmCo{sub 5}-like to a Sm{sub 2}Co{sub 7}-like phase. The composition, crystal structure, morphology, and magnetic properties of these films have been determined using Rutherford Backscattering, X-ray diffraction, and magnetization measurements. We find that we can grow films with, at room temperature, coercive fields as high as 3.3 T, but with a remanent magnetization which is lower than can be expected from the texturing. This appears to be due to the Sm content of the films, which is higher than expected from the content of the target, even at the lowest possible sputtering pressures. Moreover, we find relatively large variations of film properties using targets of nominally the same composition. At low temperatures, the coercive fields increase, as expected for these hard magnets, but in the magnetization, we observe a strong background signal from the paramagnetic impurities in the MgO substrates.

  12. Engineering the Mechanical Properties of Ultrabarrier Films Grown by Atomic Layer Deposition for the Encapsulation of Printed Electronics

    DOE PAGES

    Bulusu, Anuradha; Singh, Ankit K.; Wang, Cheng-Yin; ...

    2015-08-28

    Direct deposition of barrier films by atomic layer deposition (ALD) onto printed electronics presents a promising method for packaging devices. Films made by ALD have been shown to possess desired ultrabarrier properties, but face challenges when directly grown onto surfaces with varying composition and topography. Challenges include differing nucleation and growth rates across the surface, stress concentrations from topography and coefficient of thermal expansion (CTE) mismatch, elastic mismatch, and particle contamination that may impact the performance of the ALD barrier. In such cases, a polymer smoothing layer may be needed to coat the surface prior to ALD barrier film deposition.more » We present the impact of architecture on the performance of aluminum oxide (Al2O3)/hafnium oxide (HfO2) ALD nanolaminate barrier films deposited on fluorinated polymer layer using an optical calcium (Ca) test under damp heat. It is found that with increasing polymer thickness, the barrier films with residual tensile stress are prone to cracking resulting in rapid failure of the Ca sensor at 50{degree sign}C/85% RH. Inserting a SiNx layer with residual compressive stress between the polymer and ALD layers is found to prevent cracking over a range of polymer thicknesses with more than 95% of the Ca sensor remaining after 500 h of testing. These results suggest that controlling mechanical properties and film architecture play an important role in the performance of direct deposited ALD barriers.« less

  13. Thin yttrium iron garnet films grown by pulsed laser deposition: Crystal structure, static, and dynamic magnetic properties

    SciTech Connect

    Sokolov, N. S. Fedorov, V. V.; Korovin, A. M.; Suturin, S. M.; Baranov, D. A.; Gastev, S. V.; Krichevtsov, B. B.; Bursian, V. E.; Lutsev, L. V.; Maksimova, K. Yu.; Grunin, A. I.; Tabuchi, M.

    2016-01-14

    Pulsed laser deposition has been used to grow thin (10–84 nm) epitaxial layers of Yttrium Iron Garnet Y{sub 3}Fe{sub 5}O{sub 12} (YIG) on (111)–oriented Gadolinium Gallium Garnet substrates at different growth conditions. Atomic force microscopy showed flat surface morphology both on micrometer and nanometer scales. X-ray diffraction measurements revealed that the films are coherent with the substrate in the interface plane. The interplane distance in the [111] direction was found to be by 1.2% larger than expected for YIG stoichiometric pseudomorphic film indicating presence of rhombohedral distortion in this direction. Polar Kerr effect and ferromagnetic resonance measurements showed existence of additional magnetic anisotropy, which adds to the demagnetizing field to keep magnetization vector in the film plane. The origin of the magnetic anisotropy is related to the strain in YIG films observed by XRD. Magneto-optical Kerr effect measurements revealed important role of magnetization rotation during magnetization reversal. An unusual fine structure of microwave magnetic resonance spectra has been observed in the film grown at reduced (0.5 mTorr) oxygen pressure. Surface spin wave propagation has been demonstrated in the in-plane magnetized films.

  14. Anomalous thickness-dependent optical energy gap of ALD-grown ultra-thin CuO films

    NASA Astrophysics Data System (ADS)

    Tripathi, T. S.; Terasaki, I.; Karppinen, M.

    2016-11-01

    Usually an inverse square relation between the optical energy gap and the size of crystallites is observed for semiconducting materials due to the strong quantum localization effect. Coulomb attraction that may lead to a proportional dependence is often ignored or considered less important to the optical energy gap when the crystallite size or the thickness of a thin film changes. Here we report a proportional dependence between the optical energy gap and the thickness of ALD-grown CuO thin films due to a strong Coulomb attraction. The ultrathin films deposited in the thickness range of 9-81 nm show a p-type semiconducting behavior when analyzed by Seebeck coefficient and electrical resistivity measurements. The indirect optical energy gap nature of the films is verified from UV-vis spectrophotometric measurements. A progressive increase in the indirect optical energy gap from 1.06 to 1.24 eV is observed with the increase in the thickness of the films. The data are analyzed in the presence of Coulomb attractions using the Brus model. The optical energy gap when plotted against the cubic root of the thickness of the films shows a linear dependence.

  15. Engineering the Mechanical Properties of Ultrabarrier Films Grown by Atomic Layer Deposition for the Encapsulation of Printed Electronics

    SciTech Connect

    Bulusu, Anuradha; Singh, Ankit K.; Wang, Cheng-Yin; Dindar, Amir; Fuentes-Hernandez, Canek; Kim, Hyungchul; Cullen, David A.; Kippelen, Bernard; Graham, Samuel

    2015-08-28

    Direct deposition of barrier films by atomic layer deposition (ALD) onto printed electronics presents a promising method for packaging devices. Films made by ALD have been shown to possess desired ultrabarrier properties, but face challenges when directly grown onto surfaces with varying composition and topography. Challenges include differing nucleation and growth rates across the surface, stress concentrations from topography and coefficient of thermal expansion (CTE) mismatch, elastic mismatch, and particle contamination that may impact the performance of the ALD barrier. In such cases, a polymer smoothing layer may be needed to coat the surface prior to ALD barrier film deposition. We present the impact of architecture on the performance of aluminum oxide (Al2O3)/hafnium oxide (HfO2) ALD nanolaminate barrier films deposited on fluorinated polymer layer using an optical calcium (Ca) test under damp heat. It is found that with increasing polymer thickness, the barrier films with residual tensile stress are prone to cracking resulting in rapid failure of the Ca sensor at 50{degree sign}C/85% RH. Inserting a SiNx layer with residual compressive stress between the polymer and ALD layers is found to prevent cracking over a range of polymer thicknesses with more than 95% of the Ca sensor remaining after 500 h of testing. These results suggest that controlling mechanical properties and film architecture play an important role in the performance of direct deposited ALD barriers.

  16. Engineering the mechanical properties of ultrabarrier films grown by atomic layer deposition for the encapsulation of printed electronics

    NASA Astrophysics Data System (ADS)

    Bulusu, A.; Singh, A.; Wang, C. Y.; Dindar, A.; Fuentes-Hernandez, C.; Kim, H.; Cullen, D.; Kippelen, B.; Graham, S.

    2015-08-01

    Direct deposition of barrier films by atomic layer deposition (ALD) onto printed electronics presents a promising method for packaging devices. Films made by ALD have been shown to possess desired ultrabarrier properties, but face challenges when directly grown onto surfaces with varying composition and topography. Challenges include differing nucleation and growth rates across the surface, stress concentrations from topography and coefficient of thermal expansion mismatch, elastic constant mismatch, and particle contamination that may impact the performance of the ALD barrier. In such cases, a polymer smoothing layer may be needed to coat the surface prior to ALD barrier film deposition. We present the impact of architecture on the performance of aluminum oxide (Al2O3)/hafnium oxide (HfO2) ALD nanolaminate barrier films deposited on fluorinated polymer layer using an optical calcium (Ca) test under damp heat. It is found that with increasing polymer thickness, the barrier films with residual tensile stress are prone to cracking resulting in rapid failure of the Ca sensor at 50 °C/85% relative humidity. Inserting a SiNx layer with residual compressive stress between the polymer and ALD layers is found to prevent cracking over a range of polymer thicknesses with more than 95% of the Ca sensor remaining after 500 h of testing. These results suggest that controlling mechanical properties and film architecture play an important role in the performance of direct deposited ALD barriers.

  17. Engineering the mechanical properties of ultrabarrier films grown by atomic layer deposition for the encapsulation of printed electronics

    SciTech Connect

    Bulusu, A.; Singh, A.; Kim, H.; Wang, C. Y.; Dindar, A.; Fuentes-Hernandez, C.; Kippelen, B.; Cullen, D.; Graham, S.

    2015-08-28

    Direct deposition of barrier films by atomic layer deposition (ALD) onto printed electronics presents a promising method for packaging devices. Films made by ALD have been shown to possess desired ultrabarrier properties, but face challenges when directly grown onto surfaces with varying composition and topography. Challenges include differing nucleation and growth rates across the surface, stress concentrations from topography and coefficient of thermal expansion mismatch, elastic constant mismatch, and particle contamination that may impact the performance of the ALD barrier. In such cases, a polymer smoothing layer may be needed to coat the surface prior to ALD barrier film deposition. We present the impact of architecture on the performance of aluminum oxide (Al{sub 2}O{sub 3})/hafnium oxide (HfO{sub 2}) ALD nanolaminate barrier films deposited on fluorinated polymer layer using an optical calcium (Ca) test under damp heat. It is found that with increasing polymer thickness, the barrier films with residual tensile stress are prone to cracking resulting in rapid failure of the Ca sensor at 50 °C/85% relative humidity. Inserting a SiN{sub x} layer with residual compressive stress between the polymer and ALD layers is found to prevent cracking over a range of polymer thicknesses with more than 95% of the Ca sensor remaining after 500 h of testing. These results suggest that controlling mechanical properties and film architecture play an important role in the performance of direct deposited ALD barriers.

  18. Anomalous thickness-dependent strain states and strain-tunable magnetization in Zn-doped ferrite epitaxial films

    SciTech Connect

    Yang, Y. J.; Bao, J.; Gao, C. E-mail: cgao@ustc.edu.cn; Yang, M. M.; Luo, Z. L. E-mail: cgao@ustc.edu.cn; Hu, C. S.; Chen, X. C.; Pan, G. Q.; Huang, H. L.; Zhang, S.; Wang, J. W.; Li, P. S.; Liu, Y.; Zhao, Y. G.; Jiang, T.; Liu, Y. K.; Li, X. G.

    2014-05-07

    A series of Zn{sub x}Fe{sub 3−x}O{sub 4} (ZFO, x = 0.4) thin films were epitaxially deposited on single-crystal (001)-SrTiO{sub 3} (STO) substrates by radio frequency magnetron sputtering. The anomalous thickness-dependent strain states of ZFO films were found, i.e., a tensile in-plane strain exists in the thinner ZFO film and which monotonously turns into compressive in the thicker films. Considering the lattice constant of bulk ZFO is bigger than that of STO, this strain state cannot be explained in the conventional framework of lattice-mismatch-induced strain in the hetero-epitaxial system. This unusual phenomenon is proposed to be closely related to the Volmer-Weber film growth mode in the thinner films and incorporation of the interstitial atoms into the island's boundaries during subsequent epitaxial growth of the thicker films. The ZFO/STO epitaxial film is found in the nature of magnetic semiconductor by transport measurements. The in-plane magnetization of the ZFO/STO films is found to increase as the in-plane compressive strain develops, which is further proved in the (001)-ZFO/PMN-PT film where the film strain state can be in situ controlled with applied electric field. This compressive-strain-enhanced magnetization can be attributed to the strain-mediated electric-field-induced in-plane magnetic anisotropy field enhancement. The above results indicate that strain engineering on magnetic oxide semiconductor ZFO films is promising for novel oxide-electronic devices.

  19. Epitaxial Hexagonal Ferrites for Millimeter Wave Tunable Filters.

    DTIC Science & Technology

    1982-12-13

    anisotropy fields which, in effect, provide built-in biasing. The result is that ferrite components, similar to those used in microwave systems, can operate... method for growing hexagonal ferrites in the form of single crystal layers on non-magnetic, trAnsparmat subsrates - . The LPE method circumvents... method , single crystal hexagonal ferrites which are superior in quality to those grown by conventional methods . In order to have a more specific goal

  20. Measuring the electronic structure of atomically uniform silver films grown on silicon using angle-resolved photoemission spectroscopy

    NASA Astrophysics Data System (ADS)

    Speer, Nathan James

    Electronic structures derived from Valence electrons in thin films and at surfaces are often much different from those of their bulk counter parts. When the film thickness is less than the electron-coherence length, the boundary conditions at the surface and interface can give rise to standing-wave-like quantum-well states. Electrons in these states are often described as particles in a box. Confinement in the perpendicular direction gives rise to a quantized band structure along the same direction, where the energy spacing is determined by the film thickness. Changing the film by a single atomic layer can cause properties derived from the band structure to vary like ˜ 1/N , where N is the number of monolayers. Recent advances in thin film techniques have made it possible to fabricate films with atomically uniform thickness. Because the electronic structure is a function of film thickness, such techniques are crucial to efforts for a comprehensive understanding of thin films. In this thesis, the electronic properties of atomically uniform Ag films grown on Si(111) substrates are studied using angle-resolved photoemission spectroscopy (ARPES). Using molecular beam epitaxy (MBE) deposition at low temperatures, we are able to fabricate atomically uniform, ultra-thin Ag films on Si substrates for the first time, and the electronic structures are measured using ARPES. The electrons in these uniform film systems have very long coherence lengths and occupy standing-wave-like quantum-well states that propagate through the film and, surprisingly, can reach deep into the substrate despite a lattice mismatched, incommensurate interface. This interaction with the substrate is so strong that it can produce an electronic interference pattern in the photoemission spectra. As the film thickness increases, the electronic structure evolves to form the bulk band continuum plus separates surfaces states. A careful analysis of this evolution allows us to separate surface from bulk

  1. Optical properties and structure of HfO2 thin films grown by high pressure reactive sputtering

    NASA Astrophysics Data System (ADS)

    Martínez, F. L.; Toledano-Luque, M.; Gandía, J. J.; Cárabe, J.; Bohne, W.; Röhrich, J.; Strub, E.; Mártil, I.

    2007-09-01

    Thin films of hafnium oxide (HfO2) have been grown by high pressure reactive sputtering on transparent quartz substrates (UV-grade silica) and silicon wafers. Deposition conditions were adjusted to obtain polycrystalline as well as amorphous films. Optical properties of the films deposited on the silica substrates were investigated by transmittance and reflectance spectroscopy in the ultraviolet, visible and near infrared range. A numerical analysis method that takes into account the different surface roughness of the polycrystalline and amorphous films was applied to calculate the optical constants (refractive index and absorption coefficient). Amorphous films were found to have a higher refractive index and a lower transparency than polycrystalline films. This is attributed to a higher density of the amorphous samples, which was confirmed by atomic density measurements performed by heavy-ion elastic recoil detection analysis. The absorption coefficient gave an excellent fit to the Tauc law (indirect gap), which allowed a band gap value of 5.54 eV to be obtained. The structure of the films (amorphous or polycrystalline) was found to have no significant influence on the nature of the band gap. The Tauc plots also give information about the structure of the films, because the slope of the plot (the Tauc parameter) is related to the degree of order in the bond network. The amorphous samples had a larger value of the Tauc parameter, i.e. more order than the polycrystalline samples. This is indicative of a uniform bond network with percolation of the bond chains, in contrast to the randomly oriented polycrystalline grains separated by grain boundaries.

  2. Temperature dependent electrical properties of polyaniline film grown on paper through aniline vapor polymerization

    SciTech Connect

    Deb, K.; Bera, A.; Saha, B.; Bhowmik, K. L.; Chattopadhyay, K. K.

    2016-05-23

    Polyaniline thin film has been prepared on paper by aniline vapor deposition technique. Ferric chloride has been used as polymerizing agent in this approach. The prepared films were studied through electrical resistivity and optical properties measurements. The electrical resistivity of the polyaniline film shows significant temperature dependence. The resistance sharply falls with the increase in temperature. The optical absorbance measurements shows characteristics absorbance peak indicating the formation of conducting emeraldine salt form of polyaniline. The optical energy band gap of the film was calculated from the transmittance spectra. The optical energy band gap and electrical conductivity of the polyaniline film is well suited for their applications in electronic devices.

  3. Temperature dependent electrical properties of polyaniline film grown on paper through aniline vapor polymerization

    NASA Astrophysics Data System (ADS)

    Deb, K.; Bhowmik, K. L.; Bera, A.; Chattopadhyay, K. K.; Saha, B.

    2016-05-01

    Polyaniline thin film has been prepared on paper by aniline vapor deposition technique. Ferric chloride has been used as polymerizing agent in this approach. The prepared films were studied through electrical resistivity and optical properties measurements. The electrical resistivity of the polyaniline film shows significant temperature dependence. The resistance sharply falls with the increase in temperature. The optical absorbance measurements shows characteristics absorbance peak indicating the formation of conducting emeraldine salt form of polyaniline. The optical energy band gap of the film was calculated from the transmittance spectra. The optical energy band gap and electrical conductivity of the polyaniline film is well suited for their applications in electronic devices.

  4. Structural and optical characteristics of the hexagonal ZnO films grown on cubic MgO (001) substrates.

    PubMed

    Shen, Xiangqian; Zhou, Hua; Li, Yaping; Kang, Junyong; Zheng, Jin-Cheng; Ke, Shanming; Wang, Qingkang; Wang, Hui-Qiong

    2016-11-01

    In this Letter, we report on the structural and optical characteristics of ZnO films with a wurtzite structure grown on MgO (001) substrates with cubic structures. The ZnO films were prepared through the molecular beam epitaxy method, and growth orientation transformation from [0001] to [10-10] direction was observed with the change of growth temperature and thickness. The x-ray diffraction pole figures and in situ RHEED patterns demonstrated that the rotational relationship among grains within the ZnO films appeared in a typical two-fold rotation of about 30° for the [0001] growth orientation and four-fold rotation of about 30° or 60° for the [10-10] growth orientation, respectively. Last, we investigated their optical properties through measuring the transmission and photoluminescence spectra of the ZnO films, which showed the bulk-like bandgap feature of the ZnO films in spite of the existing growth orientation transformation.

  5. Structural, morphological, and optoelectrical characterization of Bi2S3 thin films grown by co-evaporation

    NASA Astrophysics Data System (ADS)

    Mesa, F.; Arredondo, C. A.; Vallejo, W.

    2016-03-01

    This work presents the results of synthesis and characterization of polycrystalline n-type Bi2S3 thin films. The films were grown through a chemical reaction from co-evaporation of their precursor elements in a soda-lime glass substrate. The effect of the experimental conditions on the optical, morphological structural properties, the growth rate, and the electrical conductivity (σ) was studied through spectral transmittance, X-ray diffraction (XRD), atomic force microscopy (AFM) and σ versus T measurements, respectively. The results showed that the films grow only in the orthorhombic Bi2S3 bismuthinite phase. It was also found that the Bi2S3 films present an energy band gap (Eg) of about 1.38 eV. In addition to these results, the electrical conductivity of the Bi2S3 films was affected by both the transport of free carriers in extended states of the conduction band and for variable range hopping transport mechanisms, each one predominating in a different temperature range.

  6. Thickness-Dependent Permanent Magnet Properties of Zr2 Co_{11} Thin Films Grown on Si with Pt Underlayer

    NASA Astrophysics Data System (ADS)

    Yüzüak, Gizem Durak; Yüzüak, Ercüment; Teichert, Niclas; Hütten, Andreas; Elerman, Yalçın

    2017-03-01

    Zr-Co is one of the essential magnetic materials due to its interesting magnetic and structural properties. In this work, we studied the magnetic and structural properties of Zr2 Co_{11} thin films of different thicknesses grown on Si substrate with Pt underlayer. The structural properties and chemical composition of the Zr2 Co_{11} films were investigated by X-ray diffraction analysis, scanning electron microscopy (SEM) with energy-dispersive X-ray (EDX) analysis, and atomic force microscopy-magnetic force microscopy measurements. The saturation magnetization, M(H) characteristic, and Henkel plots of the Zr-Co films were obtained by vibrating-sample magnetometry. The results show that H_{c} and (BH)_{\\max } were enhanced with decreasing layer thickness of Zr-Co. For 10-nm Zr2 Co_{11} with 20-nm Pt underlayer thin film, we observed coercive field of 2 kOe with energy product of 0.7 MGOe. Our results may be valuable for use of Zr2 Co_{11} thin films in nanomagnet applications.

  7. Band dispersion near the Fermi level for VO2 thin films grown on TiO2 (001) substrates

    NASA Astrophysics Data System (ADS)

    Saeki, K.; Wakita, T.; Muraoka, Y.; Hirai, M.; Yokoya, T.; Eguchi, R.; Shin, S.

    2009-09-01

    We have performed angle-resolved photoemission spectroscopy (ARPES) measurements of VO2 using epitaxial thin films and observed the band dispersion near the Fermi level (EF) for this compound. The VO2 thin films have been grown on TiO2 (001) single-crystal substrates using pulsed laser deposition. The films exhibit a first-order metal-insulator transition (MIT) at 305 K. In the ARPES spectra of the metallic phase for the films, the O2p band shows highly dispersive features in the binding-energy range of 3-8 eV along the Γ-Z direction. Also, the V3d state shows two dispersive bands around the Γ point near EF , indicative of two electron pockets centered at the Γ point. Both electron pockets have an occupied bandwidth of about 0.4 eV. Assuming the parabolic energy bands around the Γ point, the effective-mass ratios of the two electron pockets are estimated to be about 0.2 and 1. The present work indicates that the ARPES measurements using epitaxial thin films are promising for determining the band structure of VO2 and thus would play a crucial role to elucidate the mechanism of the MIT in VO2 .

  8. Thickness-Dependent Properties of YBCO Films Grown on GZO/CLO-Buffered NiW Substrates

    NASA Astrophysics Data System (ADS)

    Malmivirta, M.; Huhtinen, H.; Zhao, Y.; Grivel, J.-C.; Paturi, P.

    2017-01-01

    To study the role of novel Gd_2Zr_2O_7/Ce_{0.9}La_{0.1}O_2 buffer layer structure on a biaxially textured NiW substrate, a set of YBa_2Cu_3O_{7-δ } (YBCO) films with different thicknesses were prepared by pulsed laser deposition (PLD). Interface imperfections as well as thickness-dependent structural properties were observed in the YBCO thin films. The structure is also reflected into the improved superconducting properties with the highest critical current densities in films with intermediate thicknesses. Therefore, it can be concluded that the existing buffer layers need more optimization before they can be successfully used for films with various thicknesses. This issue is linked to the extremely susceptible growth method of PLD when compared to the commonly used chemical deposition methods. Nevertheless, PLD-grown films can give a hint on what to concentrate to be able to further improve the buffer layer structures for future coated conductor technologies.

  9. Superconducting properties of very high quality NbN thin films grown by high temperature chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Hazra, D.; Tsavdaris, N.; Jebari, S.; Grimm, A.; Blanchet, F.; Mercier, F.; Blanquet, E.; Chapelier, C.; Hofheinz, M.

    2016-10-01

    Niobium nitride (NbN) is widely used in high-frequency superconducting electronics circuits because it has one of the highest superconducting transition temperatures ({T}{{c}}˜ 16.5 {{K}}) and largest gap among conventional superconductors. In its thin-film form, the T c of NbN is very sensitive to growth conditions and it still remains a challenge to grow NbN thin films (below 50 nm) with high T c. Here, we report on the superconducting properties of NbN thin films grown by high-temperature chemical vapor deposition (HTCVD). Transport measurements reveal significantly lower disorder than previously reported, characterized by a Ioffe-Regel parameter ({k}{{F}}{\\ell }) ˜ 12. Accordingly we observe {T}{{c}}˜ 17.06 {{K}} (point of 50% of normal state resistance), the highest value reported so far for films of thickness 50 nm or less, indicating that HTCVD could be particularly useful for growing high quality NbN thin films.

  10. Optical and electrical properties of high-quality Ti2O3 epitaxial film grown on sapphire substrate

    NASA Astrophysics Data System (ADS)

    Fan, Haibo; Wang, Mingzi; Yang, Zhou; Ren, Xianpei; Yin, Mingli; Liu, Shengzhong

    2016-11-01

    Epitaxial film of Ti2O3 with high crystalline quality was grown on Al2O3 substrate by pulsed laser deposition process using a powder-pressed TiO2 target in active O2 flow. X-ray diffraction clearly reveals the (0006) crystalline Ti2O3 orientation and its (10overline{1} 0)_{{{{Ti}}_{ 2} {{O}}_{ 3} }} ||(10overline{1} 0)_{{sapphire}} in-plane epitaxial relationship with the substrate. Scanning electron microscopy images show that the film grew uniformly on the substrate with a Volmer-Weber mode. High-resolution transmission electron microscopy and selected area electron diffraction further confirm the high crystalline quality of the film. Transmittance spectrum shows that the Ti2O3 film is highly transparent in 400-800 nm with the optical band gap estimated to be 3.53 eV by Tauc plot. The temperature-dependent Hall effect measurement indicates that the Ti2O3 film appears to be n-type semiconductor with carrier concentration, mobility, and resistivity showing typical temperature-dependent behavior. The donor ionization energy was estimated to be 83.6 meV by linear relationship of conductivity versus temperature.

  11. Microstructural and conductivity comparison of Ag films grown on amorphous TiO2 and polycrystalline ZnO

    SciTech Connect

    Dannenberg, Rand; Stach, Eric; Glenn, Darin; Sieck, Peter; Hukari, Kyle

    2001-03-26

    8 nm thick Ag films were sputter deposited onto amorphous TiO{sub 2} underlayers 25 nm thick, and also amorphous TiO{sub 2} (25 nm)/ZnO (5 nm) multiunderlayers. The substrates were back-etched Si with a 50 nm thick LPCVD Si{sub 3}N{sub 4} electron transparent membrane. The ZnO, sputtered onto amorphous TiO{sub 2}, formed a continuous layer with a grain size of 5 nm in diameter, on the order of the film thickness. There are several microstructural differences in the Ag dependent on the underlayers, revealed by TEM. First a strong {l_brace}0001{r_brace} ZnO to {l_brace}111{r_brace} Ag fibre-texture relationship exists. On TiO{sub 2} the Ag microstructure shows many abnormal grains whose average diameter is about 60-80 nm, whereas the films on ZnO show few abnormal grains. The background matrix of normal grains on the TiO{sub 2} is roughly 15 nm, while the normal grain size on the ZnO is about 25 nm. Electron diffraction patterns show that the film on ZnO has a strong {l_brace}111{r_brace} orientation, and dark field images with this diffraction condition have a grain size of about 30 nm. In a region near the center of the TEM grid where there is the greatest local heating during deposition, Ag films grown on amorphous TiO{sub 2} are discontinuous, whereas on ZnO, the film is continuous. When films 8 nm films are grown on solid glass substrates, those with ZnO underlayers have sheet resistances of 5.68 {Omega}/, whereas those on TiO{sub 2} are 7.56 {Omega}/, and when 16 nm thick, the corresponding sheet resistances are 2.7 {Omega}/ and 3.3 {Omega}/. The conductivity difference is very repeatable. The improved conductivity is thought to be a combined effect of reduced grain boundary area per unit volume, the predominance of low grain boundary resistivity Coincidence Site Lattice boundaries from the Ag {l_brace}111{r_brace} orientation, and Ag planarization on ZnO resulting in less groove formation on deposition, concluded from atomic force microscopy.

  12. Luminescence and scintillation properties of liquid phase epitaxy grown Y2SiO5:Ce single crystalline films

    NASA Astrophysics Data System (ADS)

    Wantong, Kriangkrai; Yawai, Nattasuda; Chewpraditkul, Weerapong; Kucera, Miroslav; Hanus, Martin; Nikl, Martin

    2017-06-01

    Luminescence and scintillation properties of Y2SiO5:Ce single crystalline film (YSO:Ce-LPE) grown by the liquid phase epitaxy technique are investigated and compared to the bulk Czochralski-grown YSO:Ce single crystal (YSO:Ce-SC). The light yield (LY) and energy resolution are measured using an R6231 photomultiplier under excitation with α - and γ- rays. At 662 keV γ- rays, the LY value of 12,410 ph/MeV obtained for YSO:Ce -LPE is lower than that of 20,150 ph/MeV for YSO:Ce -SC whereas the comparable LY value and energy resolution are obtained under excitation with 5.5 MeV α- rays. The ratio of LY under excitation with α- and γ- rays (α/γ ratio) is determined. Dependence of LY on an amplifier shaping time (0.5-12 μs) is also measured.

  13. Injection of holes from the silicon substrate in Ta{sub 2}O{sub 5} films grown on silicon

    SciTech Connect

    Novkovski, N.; Atanassova, E.

    2004-10-11

    In this paper a compact model for leakage currents of metal/Ta{sub 2}O{sub 5}/SiO{sub 2}/Si structures is presented, considering tunneling and hopping conduction in a SiO{sub 2} layer and Poole-Frenkel emission in a Ta{sub 2}O{sub 5} layer. Theoretical calculations fit very well the experimental results obtained on thermally grown Ta{sub 2}O{sub 5} films over an unintentionally grown ultrathin SiO{sub 2} layer for both bias polarities. The following parameters were fitted: the SiO{sub 2} layer thickness, the hopping conductivity of a SiO{sub 2} layer, and the Poole-Frenkel defect-related constant. Experimentally observed asymmetry between different polarities was explained by the injection of holes from the silicon substrate at negative bias.

  14. High-quality β-Ga2O3 single crystals grown by edge-defined film-fed growth

    NASA Astrophysics Data System (ADS)

    Kuramata, Akito; Koshi, Kimiyoshi; Watanabe, Shinya; Yamaoka, Yu; Masui, Takekazu; Yamakoshi, Shigenobu

    2016-12-01

    β-Ga2O3 bulk crystals were grown by the edge-defined film-fed growth (EFG) process and the floating zone process. Semiconductor substrates containing no twin boundaries with sizes up to 4 in. in diameter were fabricated. It was found that Si was the main residual impurity in the EFG-grown crystals and that the effective donor concentration (N d - N a) of unintentionally doped crystals was governed by the Si concentration. Intentional n-type doping was shown to be possible. An etch pit observation revealed that the dislocation density was on the order of 103 cm-3. N d - N a for the samples annealed in nitrogen ambient was almost the same as the Si concentration, while for the samples annealed in oxygen ambient, it was around 1 × 1017 cm-3 and independent of the Si concentration.

  15. Strain in epitaxial high-index Bi2Se3(221) films grown by molecular-beam epitaxy

    NASA Astrophysics Data System (ADS)

    Li, Bin; Chen, Weiguang; Guo, Xin; Ho, Wingkin; Dai, Xianqi; Jia, Jinfeng; Xie, Maohai

    2017-02-01

    High-index Bi2Se3(221) film has been grown on In2Se3-buffered GaAs(001), in which a much retarded strain relaxation dynamics is recorded. The slow strain-relaxation process of in epitaxial Bi2Se3(221) can be attributed to the layered structure of Bi2Se3 crystal, where the epifilm grown along [221] is like a pile of weakly-coupled quintuple layer slabs stacked side-by-side on substrate. Finally, we reveal strong chemical bonding at the interface of Bi2Se3 and In2Se3 by plotting differential charge contour calculated by first-principle method. This study points to the feasibility of achieving strained TIs for manipulating the properties of topological systems.

  16. Structure disorder degree of polysilicon thin films grown by different processing: Constant C from Raman spectroscopy

    SciTech Connect

    Wang, Quan; Zhang, Yanmin; Hu, Ran; Ren, Naifei; Ge, Daohan

    2013-11-14

    Flat, low-stress, boron-doped polysilicon thin films were prepared on single crystalline silicon substrates by low pressure chemical vapor deposition. It was found that the polysilicon films with different deposition processing have different microstructure properties. The confinement effect, tensile stresses, defects, and the Fano effect all have a great influence on the line shape of Raman scattering peak. But the effect results are different. The microstructure and the surface layer are two important mechanisms dominating the internal stress in three types of polysilicon thin films. For low-stress polysilicon thin film, the tensile stresses are mainly due to the change of microstructure after thermal annealing. But the tensile stresses in flat polysilicon thin film are induced by the silicon carbide layer at surface. After the thin film doped with boron atoms, the phenomenon of the tensile stresses increasing can be explained by the change of microstructure and the increase in the content of silicon carbide. We also investigated the disorder degree states for three polysilicon thin films by analyzing a constant C. It was found that the disorder degree of low-stress polysilicon thin film larger than that of flat and boron-doped polysilicon thin films due to the phase transformation after annealing. After the flat polysilicon thin film doped with boron atoms, there is no obvious change in the disorder degree and the disorder degree in some regions even decreases.

  17. Nanostructured and wide bandgap CdS:O thin films grown by reactive RF sputtering

    SciTech Connect

    Islam, M. A.; Rahman, K. S.; Haque, F.; Rashid, M. J.; Akhtaruzzaman, M.; Sopian, K.; Sulaiman, Y.; Amin, N.

    2015-05-15

    In this study, CdS:O thin films were prepared from a 99.999% CdS target by reactive sputtering in a Ar:O{sub 2} (99:1) ambient with different RF power at room temperature. The deposited films were studied by means of XRD, SEM, EDX, Hall Effect and UV-Vis spectrometry. The incorporations of O{sub 2} into the films were observed to increase with the decrease of deposition power. The cryatallinity of the films were reduced, whereas the band gaps of the films were increased by the increase of O{sub 2} content on the films. The films were found in nano-structured grains with a compact surface. It has been seen that the highest carrier density is observed in the film with O{sub 2} at.% 21.10, while the values decreased with the further increase or decrease of O{sub 2} content on the films; indicating that specific amount of donor like O{sub 2} atoms substitute to the S atoms can improve the carrier density of the CdS:O thin film.

  18. Ionization potentials of transparent conductive indium tin oxide films covered with a single layer of fluorine-doped tin oxide nanoparticles grown by spray pyrolysis deposition

    SciTech Connect

    Fukano, Tatsuo; Motohiro, Tomoyoshi; Ida, Takashi; Hashizume, Hiroo

    2005-04-15

    Indium tin oxide (ITO) films deposited with single layers of monodispersive fluorine-doped tin oxide (FTO) nanoparticles of several nanometers in size were grown on glass substrates by intermittent spray pyrolysis deposition using conventional atomizers. These films have significantly higher ionization potentials than the bare ITO and FTO films grown using the same technique. The ITO films covered with FTO particles of 7 nm in average size show an ionization potential of 5.01 eV, as compared with {approx}4.76 and {approx}4.64 eV in ITO and FTO films, respectively, which decreases as the FTO particle size increases. The ionization potentials are practically invariant against oxidation and reduction treatments, promising a wide application of the films to transparent conducting oxide electrodes in organic electroluminescent devices and light-emitting devices of high efficiencies.

  19. EXAFS and XANES investigation of (Li, Ni) codoped ZnO thin films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Mino, Lorenzo; Gianolio, Diego; Bardelli, Fabrizio; Prestipino, Carmelo; Senthil Kumar, E.; Bellarmine, F.; Ramanjaneyulu, M.; Lamberti, Carlo; Ramachandra Rao, M. S.

    2013-09-01

    Ni doped, Li doped and (Li, Ni) codoped ZnO thin films were successfully grown using a pulsed laser deposition technique. Undoped and doped ZnO thin films were investigated using extended x-ray absorption fine structure (EXAFS) and x-ray absorption near edge spectroscopy (XANES). Preliminary investigations on the Zn K-edge of the undoped and doped ZnO thin films revealed that doping has not influenced the average Zn-Zn bond length and Debye-Waller factor. This shows that both Ni and Li doping do not appreciably affect the average local environment of Zn. All the doped ZnO thin films exhibited more than 50% of substitutional Ni, with a maximum of 77% for 2% Ni and 2% Li doped ZnO thin film. The contribution of Ni metal to the EXAFS signal clearly reveals the presence of Ni clusters. The Ni-Ni distance in the Ni0 nanoclusters, which are formed in the film, is shorter with respect to the reference Ni metal foil and the Debye-Waller factor is higher. Both facts perfectly reflect what is expected for metal nanoparticles. At the highest doping concentration (5%), the presence of Li favors the growth of a secondary NiO phase. Indeed, 2% Ni and 5% Li doped ZnO thin film shows %Nisub = 75 ± 11, %Nimet = 10 ± 8, %NiO = 15 ± 8. XANES studies further confirm that the substitutional Ni is more than 50% in all the samples. These results explain the observed magnetic properties.

  20. Compositional inhomogeneities in AlGaN thin films grown by molecular beam epitaxy: Effect on MSM UV photodetectors

    NASA Astrophysics Data System (ADS)

    Pramanik, Pallabi; Sen, Sayantani; Singha, Chirantan; Roy, Abhra Shankar; Das, Alakananda; Sen, Susanta; Bhattacharyya, A.

    2016-10-01

    Ultraviolet (UV) MSM photodetectors (PD) based on AlGaN alloys find many applications, including flame sensing. In this work we investigate the dependence of AlGaN based photodetectors grown by MBE on the kinetics of growth. MSM photodetectors were fabricated in the interdigitated configuration with Ni/Au contacts having 400 μm finger length and 10 μm finger spacing. Bulk Al0.4Ga0.6N films were grown on to sapphire substrates using an AlN buffer layer. A series of PDs were developed using the Al0.4Ga0.6N films grown under different group III/V flux ratios ranging from stoichiometric conditions to much higher than unity. Upon testing, it was observed that the otherwise identical photodetectors show significant decrease in dark current as AlGaN deposition conditions change from stoichiometric to excess group III, due to reduction of unintentional incorporation of oxygen-related point defects. In addition, the intensity and spectral dependence of the photocurrent also change, showing an extended low energy tail for the former and a sharp and prominent excitonic peak for the latter. The optical transmission measurements indicate a variation in Urbach energy with deposition conditions of the AlGaN films, although they have the same absorption edge. While all samples show a single red-shifted photoluminescence peak at room temperature, upon cooling, multiple higher energy peaks appear in the photoluminescence (PL) spectra, indicating that the alloys contain complex compositional inhomogeneities. Two types of alloy fluctuations, determined by the growth conditions, have been identified that modulate the optoelectronic properties of AlGaN by changing the spatial localization of excitons, thereby altering their stability. We identified that growth under stoichiometric conditions leads to compositional inhomogeneities that play a detrimental role in the operation of MSM photodetectors, which reduces the sharpness of the sensitivity edge, while growth under excess metal

  1. X-ray analysis of strain distribution in two-step grown epitaxial SrTiO{sub 3} thin films

    SciTech Connect

    Panomsuwan, Gasidit E-mail: g.panomsuwan@gmail.com; Takai, Osamu; Saito, Nagahiro

    2014-08-04

    Epitaxial SrTiO{sub 3} (STO) thin films were grown on (001)-oriented LaAlO{sub 3} (LAO) substrates using a two-step growth method by ion beam sputter deposition. An STO buffer layer was initially grown on the LAO substrate at a low temperature of 150 °C prior to growing the STO main layer at 750 °C. The thickness of the STO buffer layer was varied at 3, 6, and 10 nm, while the total film thickness was kept constant at approximately 110 nm. According to x-ray structural analysis, we show that the STO buffer layer plays an essential role in controlling the strain in the STO layer grown subsequently. It is found that the strains in the STO films are more relaxed with an increase in buffer layer thickness. Moreover, the strain distribution in two-step grown STO films becomes more homogeneous across the film thickness when compared to that in directly grown STO film.

  2. Elastically strained and relaxed La0.67Ca0.33MnO3 films grown on lanthanum aluminate substrates with different orientations

    NASA Astrophysics Data System (ADS)

    Boikov, Yu. A.; Serenkov, I. T.; Sakharov, V. I.; Claeson, T.

    2016-12-01

    Structure of 40-nm thick La0.67Ca0.33MnO3 (LCMO) films grown by laser evaporation on (001) and (110) LaAlO3 (LAO) substrates has been investigated using the methods of medium-energy ion scattering and X-ray diffraction. The grown manganite layers are under lateral biaxial compressive mechanical stresses. When (110)LAO wafers are used as the substrates, stresses relax to a great extent; the relaxation is accompanied by the formation of defects in a (3-4)-nm thick manganite-film interlayer adjacent to the LCMO-(110)LAO interface. When studying the structure of the grown layers, their electro- and magnetotransport parameters have been measured. The electroresistance of the LCMO films grown on the substrates of both types reached a maximum at temperature T M of about 250 K. At temperatures close to T M magnetoresistance of the LCMO/(110)LAO films exceeds that of the LCMO/(001)LAO films by 20-30%; however, the situation is inverse at low temperatures ( T < 150 K). At T < T M , the magnetotransport in the grown manganite films significantly depends on the spin ordering in ferromagnetic domains, which increase with a decrease in temperature.

  3. Nanostructured and amorphous-like tungsten films grown by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Dellasega, D.; Merlo, G.; Conti, C.; Bottani, C. E.; Passoni, M.

    2012-10-01

    An experimental investigation of nanostructured, micrometer-thick, tungsten films deposited by pulsed laser deposition is presented. The films are compact and pore-free, with crystal grain sizes ranging from 14 nm to less than 2 nm. It is shown how, by properly tailoring deposition rate and kinetic energy of ablated species, it is possible to achieve a detailed and separate control of both film morphology and structure. The role of the main process parameters, He background pressure, laser fluence, and energy, is elucidated. In contrast with W films produced with other PVD techniques, β-phase growth is avoided and the presence of impurities and contaminants, like oxygen, is not correlated with film structure. These features make these films interesting for the development of coatings with improved properties, like increased corrosion resistance and enhanced diffusion barriers.

  4. Post-annealing effects on ZnS thin films grown by using the CBD method

    NASA Astrophysics Data System (ADS)

    Ahn, Heejin; Um, Youngho

    2015-09-01

    Herein, the structural, morphological, and optical properties of zinc sulfide (ZnS) thin films deposited via the chemical bath deposition method are reported. These films were deposited on soda-lime glass (SLG) substrates by using ZnSO4, thiourea, and 25% ammonia at 90 °C. The effect of changing the annealing temperature from 100 °C to 300 °C on the properties of the ZnS thin films was investigated. X-ray diffraction (XRD) patterns showed that the ZnS thin film annealed at 100 °C had an amorphous structure; however, as the annealing temperature was increased, the crystalline quality of the thin film was enhanced. Moreover, transmission measurements showed that the optical transmittance was about 80% for wavelengths above 500 nm. The band gap energy (E g ) value of the film annealed at 300 °C was decreased to about 3.82 eV.

  5. The Effects of Substrate Surface Treatments on the Defect Incorporation in Hydride VPE Grown InGaAs Films.

    DTIC Science & Technology

    1984-01-05

    AD-RI37 488 THE EFFECTS OF SUBSTRATE SURFACE TREATMENTS ON THE i/i DEFECT INCORPORATION I..(U) COLORADO STATEUUIIV FORT COLLINS DEPT OF ELECTRICAL...WA n 11111125 liii411.6 MICROCOPY RESOLUTION TEST CHART NATIONAL BUREAU OF STNA-19- THE EFFECTS OF SUBSTRATE SURFACE TREATMENTS ON THE qDEFECT...b.) in HCI (37.5x) ---------- 12 4. InP films grown on a substrate bathed in PH3 (left) and b.) a substrate etched in HCl (right

  6. Electron traps as major recombination centers in n-GaN films grown by metalorganic chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Lee, In-Hwan; Polyakov, Alexander Y.; Smirnov, Nikolai B.; Yakimov, Eugene B.; Tarelkin, Sergey A.; Turutin, Andery V.; Shemerov, Ivan V.; Pearton, Stephen J.

    2016-06-01

    For a group of n-GaN films grown by metalorganic chemical vapor deposition (MOCVD) using both straight MOCVD and epitaxial lateral overgrowth techniques (ELOG proper or pendeo overgrowth), the spectra of deep traps were measured by deep-level transient spectroscopy (DLTS) with electrical or optical injection (ODLTS). The results were compared with diffusion length measurement results obtained from electron-beam-induced current experiments. The results strongly indicate that deep electron traps near E c - 0.56 eV could be the major recombination centers determining the diffusion length values in pendeo samples.

  7. Improving stability of photoluminescence of ZnSe thin films grown by molecular beam epitaxy by incorporating Cl dopant

    SciTech Connect

    Wang, J. S.; Shen, J. L.; Chen, W. J.; Tsai, Y. H.; Wang, H. H.; Yang, C. S.; Chen, R. H.; Tsai, C. D.

    2011-01-10

    This investigation studies the effect of chlorine (Cl) dopant in ZnSe thin films that were grown by molecular beam epitaxy on their photoluminescence (PL) and the stability thereof. Free excitonic emission was observed at room-temperature in the Cl-doped sample. Photon irradiation with a wavelength of 404 nm and a power density of 9.1 W/cm{sup 2} has a much stronger effect on PL degradation than does thermal heating to a temperature of 150 deg. C. Additionally, this study shows that the generation of nonradiative centers by both photon irradiation and thermal heating can be greatly inhibited by incorporating Cl dopant.

  8. On the correlation between nanoscale structure and magnetic properties in ordered mesoporous cobalt ferrite (CoFe2O4) thin films.

    PubMed

    Quickel, Thomas E; Le, Van H; Brezesinski, Torsten; Tolbert, Sarah H

    2010-08-11

    In this work, we report the synthesis of periodic nanoporous cobalt ferrite (CFO) that exhibits tunable room temperature ferrimagnetism. The porous cubic CFO frameworks are fabricated by coassembly of inorganic precursors with a large amphiphilic diblock copolymer, referred to as KLE. The inverse spinel framework boasts an ordered open network of pores averaging 14 nm in diameter. The domain sizes of the crystallites are tunable from 6 to 15 nm, a control which comes at little cost to the ordering of the mesostructure. Increases in crystalline domain size directly correlate with increases in room temperature coercivity. In addition, these materials show a strong preference for out-of-plane oriented magnetization, which is unique in a thin film system. The preference is explained by in-plane tensile strain, combined with relaxation of the out-of-plane strain through flexing of the mesopores. It is envisioned that the pores of this ferrimagnet could facilitate the formation of a diverse range of exchange coupled composite materials.

  9. Ferrite-Piezoelectric Layered Composites: Synthesis and Magnetoelectric Characterization

    NASA Astrophysics Data System (ADS)

    Hayes, R. W.; Srinivasan, G.

    2004-10-01

    The observation of strong magnetoelectric effects is reported in thick film bilayers and multilayers of ferrite-lead titanate zirconate (PZT). The ferrites used in our studies included pure and zinc substituted cobalt-, nickel- and lithium ferrites. Samples were prepared by sintering 10-40 mm thick films obtained by tape-casting. Measurements of ME voltage coefficients at 10-1000 Hz indicated a giant ME effect in nickel ferrite-PZT, but a relatively weak coupling in other ferrite-PZT systems. Evidence was found for enhancement in ME coefficients when Zn was substituted in ferrites. The Zn-assisted increase was attributed to low anisotropy and high permeability that resulted in favorable magneto-mechanical coupling in the composites. G. Srinivasan, E. T. Rasmussen, and R. Hayes, Phys. Rev. B 67, 014418 (2003) Supported by NSF and ARO grants.

  10. Structural and electrical properties of ultrathin niobium nitride films grown by atomic layer deposition

    NASA Astrophysics Data System (ADS)

    Linzen, S.; Ziegler, M.; Astafiev, O. V.; Schmelz, M.; Hübner, U.; Diegel, M.; Il’ichev, E.; Meyer, H.-G.

    2017-03-01

    We studied and optimised the properties of ultrathin superconducting niobium nitride films fabricated with a plasma-enhanced atomic layer deposition (PEALD) process. By adjusting process parameters, the chemical embedding of undesired oxygen into the films was minimised and a film structure consisting of mainly polycrystalline niobium nitride with a small fraction of amorphous niobium oxide and niobium oxo-nitrides were formed. For this composition a critical temperature of 13.8 K and critical current densities of 7 × 106 A cm–2 at 4.2 K were measured on 40 nm thick films. A fundamental correlation between these superconducting properties and the crystal lattice size of the cubic δ-niobium-nitride grains were found. Moreover, the film thickness variation between 40 and 2 nm exhibits a pronounced change of the electrical conductivity at room temperature and reveals a superconductor–insulator-transition in the vicinity of 3 nm film thickness at low temperatures. The thicker films with resistances up to 5 kΩ per square in the normal state turn to the superconducting one at low temperatures. The perfect thickness control and film homogeneity of the PEALD growth make such films extremely promising candidates for developing novel devices on the coherent quantum phase slip effect.

  11. Structural and electronic properties of polar MnO ultrathin film grown on Ag(111)

    SciTech Connect

    Kundu, Asish K. Menon, Krishnakumar S. R.

    2016-05-23

    Surface electronic structure of ultrathin polar MnO film was studied by Low-energy Electron Diffraction (LEED) and Photoemission Spectroscopic (PES) techniques. Epitaxial monolayer to facet formation with increasing film thickness has been observed by LEED. Our LEED result shows p(2x2) surface reconstruction along with facet formation, stabilize the polar MnO(111) surface. The core levels and the valence band electronic structure of MnO films have been studied as a function of film thickness using X-ray and ultraviolet photoelectron spectroscopy techniques.

  12. Thermally driven stability of octadecylphosphonic acid thin films grown on SS316L.

    PubMed

    Lim, Min Soo; Smiley, Katelyn J; Gawalt, Ellen S

    2010-01-01

    Stainless steel 316L is widely used as a biomedical implant material; however, there is concern about the corrosion of metallic implants in the physiological environment. The corrosion process can cause mechanical failure due to resulting cracks and cavities in the implant. Alkyl phosphonic acid forms a thin film by self-assembly on the stainless steel surface and this report conclusively shows that thermal treatment of the octadecylphosphonic acid (ODPA) film greatly enhances the stability of the ODPA molecules on the substrate surface. AFM images taken from the modified substrates revealed that thermally treated films remain intact after methanol, THF, and water flushes, whereas untreated films suffer substantial loss. Water contact angles also show that the hydrophobicity of thermally treated films does not diminish after being incubated in a dynamic flow of water for a 3-hour period, whereas the untreated film becomes increasingly hydrophilic due to loss of ODPA. IR spectra taken of both treated and untreated films after water and THF flushes show that the remaining film retains its initial crystallinity. A model is suggested to explain the stability of ODPA film enhanced by thermal treatment. An ODPA molecule is physisorbed to the surface weakly by hydrogen bonding. Heating drives away water molecules leading to the formation of strong monodentate or mixed mono/bi-dentate bonds of ODPA molecule to the surface.

  13. Thermally Driven Stability of Octadecylphosphonic Acid Thin Films Grown on SS316L

    PubMed Central

    Lim, Min Soo; Smiley, Katelyn J.; Gawalt, Ellen S.

    2010-01-01

    Stainless steel 316L is widely used as a biomedical implant material; however, there is concern about the corrosion of metallic implants in the physiological environment. The corrosion process can cause mechanical failure due to resulting cracks and cavities in the implant. Alkyl phosphonic acid forms a thin film by self-assembly on the stainless steel surface and this report conclusively shows that thermal treatment of the octadecylphosphonic acid (ODPA) film greatly enhances the stability of the ODPA molecules on the substrate surface. AFM images taken from the modified substrates revealed that thermally treated films remain intact after methanol, THF and water flushes while untreated films suffer substantial loss. Water contact angles also show that the hydrophobicity of thermally treated films does not diminish after being incubated in a dynamic flow of water for a three hour period while the untreated film becomes increasingly hydrophilic due to loss of ODPA. IR spectra taken of both treated and untreated films after water and THF flushes show that the remaining film retains its initial crystallinity. A model is suggested to explain the stability of ODPA film enhanced by thermal treatment. An ODPA molecule is physisorbed to the surface weakly by hydrogen bonding. Heating drives away water molecules leading to the formation of strong monodentate or mixed mono/bi-dentate bonds of ODPA molecule to the surface. PMID:20648546

  14. Structural and electronic properties of polar MnO ultrathin film grown on Ag(111)

    NASA Astrophysics Data System (ADS)

    Kundu, Asish K.; Menon, Krishnakumar S. R.

    2016-05-01

    Surface electronic structure of ultrathin polar MnO film was studied by Low-energy Electron Diffraction (LEED) and Photoemission Spectroscopic (PES) techniques. Epitaxial monolayer to facet formation with increasing film thickness has been observed by LEED. Our LEED result shows p(2x2) surface reconstruction along with facet formation, stabilize the polar MnO(111) surface. The core levels and the valence band electronic structure of MnO films have been studied as a function of film thickness using X-ray and ultraviolet photoelectron spectroscopy techniques.

  15. Fractal features of CdTe thin films grown by RF magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Hosseinpanahi, Fayegh; Raoufi, Davood; Ranjbarghanei, Khadijeh; Karimi, Bayan; Babaei, Reza; Hasani, Ebrahim

    2015-12-01

    Cadmium telluride (CdTe) thin films were prepared by RF magnetron sputtering on glass substrates at room temperature (RT). The film deposition was performed for 5, 10, and 15 min at power of 30 W with a frequency of 13.56 MHz. The crystal structure of the prepared CdTe thin films was studied by X-ray diffraction (XRD) technique. XRD analyses indicate that the CdTe films are polycrystalline, having zinc blende structure of CdTe irrespective of their deposition time. All CdTe films showed a preferred orientation along (1 1 1) crystalline plane. The surface morphology characterization of the films was studied using atomic force microscopy (AFM). The quantitative AFM characterization shows that the RMS surface roughness of the prepared CdTe thin films increases with increasing the deposition time. The detrended fluctuation analysis (DFA) and also multifractal detrended fluctuation analysis (MFDFA) methods showed that prepared CdTe thin films have multifractal nature. The complexity, roughness of the CdTe thin films and strength of the multifractality increase as deposition time increases.

  16. Antimony segregation and n-type doping in Si/Si(111) films grown by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Yurasov, D. V.; Drozdov, M. N.; Schmagin, V. B.; Yunin, P. A.; Novikov, A. V.

    2017-10-01

    The temperature dependence of antimony segregation in Si/Si(111) films grown by molecular-beam epitaxy was investigated experimentally. The obtained results were found to be qualitatively similar to the previously reported data for Si(001) case, but rather significant quantitative differences were observed. It was obtained that segregation ratio, which is defined as surface-to-bulk impurity concentration ratio, varies by nearly 5 orders of magnitude in the relatively narrow temperature interval of 500-675 °C for Si(111). This finding allowed to disseminate the previously proposed technique of selective doping of Si(001) to the Si(111) case. Using this technique selectively n-type doped Si films were fabricated which have abrupt boundaries of the antimony concentration profiles. A profile abruptness as low as 1.5 nm/decade was obtained.

  17. High quality, transferrable graphene grown on single crystal Cu(111) thin films on basal-plane sapphire

    NASA Astrophysics Data System (ADS)

    Reddy, Kongara M.; Gledhill, Andrew D.; Chen, Chun-Hu; Drexler, Julie M.; Padture, Nitin P.

    2011-03-01

    The current method of growing large-area graphene on polycrystalline Cu surfaces (foils or thin films) and its transfer to arbitrary substrates is technologically attractive. However, the quality of graphene can be improved significantly by growing it on single-crystal Cu surfaces. Here we show that high quality, large-area graphene can be grown on epitaxial single-crystal Cu(111) thin films on reusable basal-plane sapphire [α-Al2O3(0001)] substrates for transfer to another substrate. While enabling graphene growth on Cu single-crystal surfaces, this method has the potential to avoid the high cost and extensive damage to graphene associated with sacrificing bulk single-crystal Cu during graphene transfer.

  18. Electrical property measurements of Cr-N codoped TiO2 epitaxial thin films grown by pulsed laser deposition

    SciTech Connect

    Jacimovic, J; Gaal, R; Magrez, Arnaud; Forro, Laszlo; Regmi, Murari; Eres, Gyula

    2013-01-01

    The temperature dependent resistivity and thermo-electric power of Cr-N codoped TiO2 were compared with that of single element N and Cr doped and undoped TiO2 using epitaxial anatase thin films grown by pulsed laser deposition on (100) LaAlO3 substrates. The resistivity plots and especially the thermoelectric power data confirm that codoping is not a simple sum of single element doping. However, the negative sign of the Seebeck coefficient indicates electron dominated transport independent of doping. The narrowing distinction among the effects of different doping methods combined with increasing resistivity of the films with improving crystalline quality of TiO2 suggest that structural defects play a critical role in the doping process.

  19. Fano interference of the Raman phonon in heavily boron-doped diamond films grown by chemical vapor deposition

    SciTech Connect

    Ager, J.W. III; Walukiewicz, W.; McCluskey, M. ); Plano, M.A.; Landstrass, M.I. )

    1995-01-30

    A series of boron-doped polycrystalline diamond films grown by direct current and microwave plasma deposition was studied with Raman and infrared (IR) absorption spectroscopy. A Fano line shape is observed in the Raman spectra for films with a boron concentration in a narrow range near 10[sup 21] cm[sup [minus]3]. The appearance of the Fano line shape is correlated with the disappearance of discrete electronic transitions of the boron acceptor observed in the IR spectrum and the shift of the broadened peak to lower energy. The Fano interaction is attributed to a quantum mechanical interference between the Raman phonon (0.165 eV) and transitions from the broadened impurity band to continuum states composed of excited acceptor and valence band states.

  20. Resistive switching phenomena of HfO2 films grown by MOCVD for resistive switching memory devices

    NASA Astrophysics Data System (ADS)

    Kim, Hee-Dong; Yun, Min Ju; Kim, Sungho

    2016-08-01

    The resistive switching phenomena of HfO2 films grown by using metal organic chemical vapor deposition (MOCVD) was studied for the application of resistive random access memory (ReRAM) devices. In the fabricated Pt/HfO2/TiN memory cells, bipolar resistive switching characteristics were observed, and the set and reset states were measured to be as low as 7 μA and 4 μA, respectively, at V READ = 1 V. Regarding the resistive switching performance, stable resistive switching (RS) performance was observed under 40 repetitive dc cycles with small variations of set/reset voltages and the currents and good retention characteristics of over 105 s in both the low-resistance state (LRS) and the high-resistance state (HRS). These results show the possibility of using MOCVDgrown HfO2 films as a promising resistive switching materials for ReRAM applications.