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Sample records for force microscope cantilevers

  1. Adaptive control of force microscope cantilever dynamics

    NASA Astrophysics Data System (ADS)

    Jensen, S. E.; Dougherty, W. M.; Garbini, J. L.; Sidles, J. A.

    2007-09-01

    Magnetic resonance force microscopy (MRFM) and other emerging scanning probe microscopies entail the detection of attonewton-scale forces. Requisite force sensitivities are achieved through the use of soft force microscope cantilevers as high resonant-Q micromechanical oscillators. In practice, the dynamics of these oscillators are greatly improved by the application of force feedback control computed in real time by a digital signal processor (DSP). Improvements include increased sensitive bandwidth, reduced oscillator ring up/down time, and reduced cantilever thermal vibration amplitude. However, when the cantilever tip and the sample are in close proximity, electrostatic and Casimir tip-sample force gradients can significantly alter the cantilever resonance frequency, foiling fixed-gain narrow-band control schemes. We report an improved, adaptive control algorithm that uses a Hilbert transform technique to continuously measure the vibration frequency of the thermally-excited cantilever and seamlessly adjust the DSP program coefficients. The closed-loop vibration amplitude is typically 0.05 nm. This adaptive algorithm enables narrow-band formally-optimal control over a wide range of resonance frequencies, and preserves the thermally-limited signal to noise ratio (SNR).

  2. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.

    PubMed

    Gates, Richard S; Reitsma, Mark G

    2007-08-01

    A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Systeme International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.

  3. Reconstructing the distributed force on an atomic force microscope cantilever.

    PubMed

    Wagner, Ryan; Killgore, Jason

    2017-03-10

    A methodology is developed to reconstruct the force applied to an atomic force microscopy (AFM) cantilever given the shape in which it vibrates. This is accomplished by rewriting Bernoulli-Euler beam theory such that the force on the cantilever is approximated as a linear superposition of the theoretical cantilever eigenmodes. The weighting factors in this summation are calculated from the amplitude and phase measured along the length of the cantilever. The accuracy of the force reconstruction is shown to depend on the frequency at which the measurement is performed, the number of discrete points measured along the length of the cantilever, and the signal-to-noise ratio of the measured signal. In contrast to other AFM force reconstruction techniques, this method can reconstruct the distribution of force applied over the length of the AFM cantilever. However, this method performs poorly for localized forces applied to the cantilever, such as is typical of most tip-sample interaction forces. Proof of concept experiments are performed on an electrostatically excited cantilever and the expected force distribution is recovered. This force reconstruction technique offers previously unavailable insight into the distributed forces experienced by an AFM cantilever.

  4. Reconstructing the distributed force on an atomic force microscope cantilever

    NASA Astrophysics Data System (ADS)

    Wagner, Ryan; Killgore, Jason

    2017-03-01

    A methodology is developed to reconstruct the force applied to an atomic force microscopy (AFM) cantilever given the shape in which it vibrates. This is accomplished by rewriting Bernoulli–Euler beam theory such that the force on the cantilever is approximated as a linear superposition of the theoretical cantilever eigenmodes. The weighting factors in this summation are calculated from the amplitude and phase measured along the length of the cantilever. The accuracy of the force reconstruction is shown to depend on the frequency at which the measurement is performed, the number of discrete points measured along the length of the cantilever, and the signal-to-noise ratio of the measured signal. In contrast to other AFM force reconstruction techniques, this method can reconstruct the distribution of force applied over the length of the AFM cantilever. However, this method performs poorly for localized forces applied to the cantilever, such as is typical of most tip–sample interaction forces. Proof of concept experiments are performed on an electrostatically excited cantilever and the expected force distribution is recovered. This force reconstruction technique offers previously unavailable insight into the distributed forces experienced by an AFM cantilever.

  5. Lateral force microscope calibration using a modified atomic force microscope cantilever

    SciTech Connect

    Reitsma, M. G.

    2007-10-15

    A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.

  6. Atomic force microscope cantilever calibration using a focused ion beam.

    PubMed

    Slattery, Ashley D; Quinton, Jamie S; Gibson, Christopher T

    2012-07-20

    A calibration method is presented for determining the spring constant of atomic force microscope (AFM) cantilevers, which is a modification of the established Cleveland added mass technique. A focused ion beam (FIB) is used to remove a well-defined volume from a cantilever with known density, substantially reducing the uncertainty usually present in the added mass method. The technique can be applied to any type of AFM cantilever; but for the lowest uncertainty it is best applied to silicon cantilevers with spring constants above 0.7 N m(-1), where uncertainty is demonstrated to be typically between 7 and 10%. Despite the removal of mass from the cantilever, the calibration method presented does not impair the probes' ability to acquire data. The technique has been extensively tested in order to verify the underlying assumptions in the method. This method was compared to a number of other calibration methods and practical improvements to some of these techniques were developed, as well as important insights into the behavior of FIB modified cantilevers. These results will prove useful to research groups concerned with the application of microcantilevers to nanoscience, in particular for cases where maintaining pristine AFM tip condition is critical.

  7. High-speed force mapping on living cells with a small cantilever atomic force microscope

    SciTech Connect

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

    2014-07-15

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  8. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  9. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.

    PubMed

    Long, Christian J; Cannara, Rachel J

    2015-07-01

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  10. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

    SciTech Connect

    Chung, Koo-Hyun; Reitsma, Mark G.

    2010-02-15

    This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.

  11. Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor

    SciTech Connect

    Sader, John E.; Friend, James R.

    2014-11-15

    A simplified method for calibrating atomic force microscope cantilevers was recently proposed by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012); Sec. III D] that relies solely on the resonant frequency and quality factor of the cantilever in fluid (typically air). This method eliminates the need to measure the hydrodynamic function of the cantilever, which can be time consuming given the wide range of cantilevers now available. Using laser Doppler vibrometry, we rigorously assess the accuracy of this method for a series of commercially available cantilevers and explore its performance under non-ideal conditions. This shows that the simplified method is highly accurate and can be easily implemented to perform fast, robust, and non-invasive spring constant calibration.

  12. Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

    SciTech Connect

    Sader, John E.; Sanelli, Julian A.; Adamson, Brian D.; Bieske, Evan J.; Monty, Jason P.; Marusic, Ivan; Wei Xingzhan; Mulvaney, Paul; Crawford, Simon A.; Friend, James R.

    2012-10-15

    The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically uses the hydrodynamic function for a cantilever of rectangular plan view geometry. Here, we present hydrodynamic functions for a series of irregular and non-rectangular atomic force microscope cantilevers that are commonly used in practice. Cantilever geometries of arrow shape, small aspect ratio rectangular, quasi-rectangular, irregular rectangular, non-ideal trapezoidal cross sections, and V-shape are all studied. This enables the spring constants of all these cantilevers to be accurately and routinely determined through measurement of their resonant frequency and quality factor in fluid (such as air). An approximate formulation of the hydrodynamic function for microcantilevers of arbitrary geometry is also proposed. Implementation of the method and its performance in the presence of uncertainties and non-idealities is discussed, together with conversion factors for the static and dynamic spring constants of these cantilevers. These results are expected to be of particular value to the design and application of micro- and nanomechanical systems in general.

  13. Spring constant calibration of atomic force microscope cantilevers of arbitrary shape.

    PubMed

    Sader, John E; Sanelli, Julian A; Adamson, Brian D; Monty, Jason P; Wei, Xingzhan; Crawford, Simon A; Friend, James R; Marusic, Ivan; Mulvaney, Paul; Bieske, Evan J

    2012-10-01

    The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically uses the hydrodynamic function for a cantilever of rectangular plan view geometry. Here, we present hydrodynamic functions for a series of irregular and non-rectangular atomic force microscope cantilevers that are commonly used in practice. Cantilever geometries of arrow shape, small aspect ratio rectangular, quasi-rectangular, irregular rectangular, non-ideal trapezoidal cross sections, and V-shape are all studied. This enables the spring constants of all these cantilevers to be accurately and routinely determined through measurement of their resonant frequency and quality factor in fluid (such as air). An approximate formulation of the hydrodynamic function for microcantilevers of arbitrary geometry is also proposed. Implementation of the method and its performance in the presence of uncertainties and non-idealities is discussed, together with conversion factors for the static and dynamic spring constants of these cantilevers. These results are expected to be of particular value to the design and application of micro- and nanomechanical systems in general.

  14. A direct micropipette-based calibration method for atomic force microscope cantilevers

    PubMed Central

    Liu, Baoyu; Yu, Yan; Yao, Da-Kang; Shao, Jin-Yu

    2009-01-01

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundreds of newtons per meter. Under appropriate loading conditions, this new method yields measurement accuracy and precision both within 10%, with higher performance for softer cantilevers. Furthermore, this method may greatly enhance the accuracy and precision of calibration for colloidal probes. PMID:19566228

  15. Microdrops on atomic force microscope cantilevers: evaporation of water and spring constant calibration.

    PubMed

    Bonaccurso, Elmar; Butt, Hans-Jürgen

    2005-01-13

    The evaporation of water drops with radii approximately 20 microm was investigated experimentally by depositing them onto atomic force microscope (AFM) cantilevers and measuring the deflection versus time. Because of the surface tension of the liquid, the Laplace pressure inside the drop, and the change of interfacial stress at the solid-liquid interface, the cantilever is deflected by typically a few hundred nanometers. The experimental results are in accordance with an analytic theory developed. The evaporation process could be monitored with high accuracy even at the last stage of evaporation because (1) cantilever deflections can be measured with nanometer resolution and (2) the time resolution, given by the inverse of the resonance frequency of the cantilever of approximately 0.3 ms, is much faster than the typical evaporation time of 1 s. Experimental results indicate that evaporation of the last thin layer of water is significantly slower than the rest of the drop, which can be due to surface forces. This drop-on-cantilever system can also be used to analyze the drop impact dynamics on a surface and to determine the spring constant of cantilevers.

  16. Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: A kinetostatic method

    SciTech Connect

    Tseytlin, Yakov M.

    2008-02-15

    Our previous study of the particle mass sensor has shown a large ratio (up to thousands) between the spring constants of a rectangular cantilever in higher mode vibration and at the static bending or natural mode vibration. This has been proven by us through the derived nodal point position equation. That solution is good for a cantilever with the free end in noncontact regime and the probe shifted from the end to an effective section and contacting a soft object. Our further research shows that the same nodal position equation with the proper frequency equations may be used for the same spring constant ratio estimation if the vibrating at higher mode cantilever's free end has a significant additional mass clamped to it or that end is in permanent contact with an elastic or hard measurand object (reference cantilever). However, in the latter case, the spring constant ratio is much smaller (in tens) than in other mentioned cases at equal higher (up to fourth) vibration modes. We also present the spring constant ratio for a vibrating at higher eigenmode V-shaped cantilever, which is now in wide use for atomic force microscopy. The received results on the spring constant ratio are in good (within a few percent) agreement with the theoretical and experimental data published by other researchers. The knowledge of a possible spring constant transformation is important for the proper calibration and use of an atomic force microscope with vibrating cantilever in the higher eigenmodes for measurement and imaging with enlarged resolution.

  17. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    SciTech Connect

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E.

    2014-09-15

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

  18. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers

    SciTech Connect

    Sader, John E.; Friend, James R.

    2015-05-15

    Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever’s spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type.

  19. Near-Field Acoustical Imaging using Lateral Bending Mode of Atomic Force Microscope Cantilevers

    NASA Astrophysics Data System (ADS)

    Caron, A.; Rabe, U.; Rödel, J.; Arnold, W.

    Scanning probe microscopy techniques enable one to investigate surface properties such as contact stiffness and friction between the probe tip and a sample with nm resolution. So far the bending and the torsional eigenmodes of an atomic force microscope cantilever have been used to image variations of elasticity and shear elasticity, respectively. Such images are near-field images with the resolution given by the contact radius typically between 10 nm and 50 nm. We show that the flexural modes of a cantilever oscillating in the width direction and parallel to the sample surface can also be used for imaging. Additional to the dominant in-plane component of the oscillation, the lateral modes exhibit a vertical component as well, provided there is an asymmetry in the cross-section of the cantilever or in its suspension. The out-of-plane deflection renders the lateral modes detectable by the optical position sensors used in atomic force microscopes. We studied cracks which were generated by Vickers indents, in submicro- and nanocrystalline ZrO2. Images of the lateral contact stiffness were obtained by vibrating the cantilever close to a contact-resonance frequency. A change in contact stiffness causes a shift of the resonant frequency and hence a change of the cantilever vibration amplitude. The lateral contact-stiffness images close to the crack faces display a contrast that we attribute to altered elastic properties indicating a process zone. This could be caused by a stress-induced phase transformation during crack propagation. Using the contact mode of an atomic force microscope, we measured the crack-opening displacement as a function of distance from the crack tip, and we determined the crack-tip toughness Ktip. Furthermore, K1c was inferred from the length of radial cracks of Vickers indents that were measured using classical scanning acoustic microscopy

  20. A virtual instrument to standardise the calibration of atomic force microscope cantilevers

    NASA Astrophysics Data System (ADS)

    Sader, John E.; Borgani, Riccardo; Gibson, Christopher T.; Haviland, David B.; Higgins, Michael J.; Kilpatrick, Jason I.; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J.; Slattery, Ashley D.; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-09-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This calibration is performed without reference to a global standard, hindering the robust comparison of force measurements reported by different laboratories. Here, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others—standardising AFM force measurements—and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibration.

  1. A virtual instrument to standardise the calibration of atomic force microscope cantilevers.

    PubMed

    Sader, John E; Borgani, Riccardo; Gibson, Christopher T; Haviland, David B; Higgins, Michael J; Kilpatrick, Jason I; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J; Slattery, Ashley D; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-09-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This calibration is performed without reference to a global standard, hindering the robust comparison of force measurements reported by different laboratories. Here, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others-standardising AFM force measurements-and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibration.

  2. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.

    PubMed

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-10-29

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.

  3. Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method

    PubMed Central

    Gates, Richard S.; Reitsma, Mark G.; Kramar, John A.; Pratt, Jon R.

    2011-01-01

    The evolution of the atomic force microscope into a useful tool for measuring mechanical properties of surfaces at the nanoscale has spurred the need for more precise and accurate methods for calibrating the spring constants of test cantilevers. Groups within international standards organizations such as the International Organization for Standardization and the Versailles Project on Advanced Materials and Standards (VAMAS) are conducting studies to determine which methods are best suited for these calibrations and to try to improve the reproducibility and accuracy of these measurements among different laboratories. This paper expands on a recent mini round robin within VAMAS Technical Working Area 29 to measure the spring constant of a single batch of triangular silicon nitride cantilevers sent to three international collaborators. Calibration techniques included reference cantilever, added mass, and two forms of thermal methods. Results are compared to measurements traceable to the International System of Units provided by an electrostatic force balance. A series of guidelines are also discussed for procedures that can improve the running of round robins in atomic force microscopy. PMID:26989594

  4. Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory.

    PubMed

    Lee, Haw-Long; Chang, Win-Jin

    2016-01-01

    The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride (CCl4), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, CCl4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids.

  5. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied – in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry – neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  6. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  7. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope.

    PubMed

    Sader, John E; Lu, Jianing; Mulvaney, Paul

    2014-11-01

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied - in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry - neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  8. On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids

    SciTech Connect

    Kiracofe, Daniel; Raman, Arvind

    2010-02-15

    The effect of hydrodynamic loading on the eigenmode shapes, modal stiffnesses, and optical lever sensitivities of atomic force microscope (AFM) microcantilevers is investigated by measuring the vibrations of such microcantilevers in air and water using a scanning laser Doppler vibrometer. It is found that for rectangular tipless microcantilevers, the measured fundamental and higher eigenmodes and their equivalent stiffnesses are nearly identical in air and in water. However, for microcantilevers with a tip mass or for picket shaped cantilevers, there is a marked difference in the second (and higher) eigenmode shapes between air and water that leads to a large decrease in their modal stiffness in water as compared to air as well as a decrease in their optical lever sensitivity. These results are explained in terms of hydrodynamic interactions of microcantilevers with nonuniform mass distribution. The results clearly demonstrate that tip mass and hydrodynamic loading must be taken into account in stiffness calibration and optical lever sensitivity calibration while using higher-order eigenmodes in dynamic AFM.

  9. Digital control of force microscope cantilevers using a field programmable gate array.

    PubMed

    Jacky, Jonathan P; Garbini, Joseph L; Ettus, Matthew; Sidles, John A

    2008-12-01

    This report describes a cantilever controller for magnetic resonance force microscopy based on a field programmable gate array, along with the hardware and software used to integrate the controller into an experiment. The controller is assembled from a low-cost commercially available software defined radio device and libraries of open-source software. The controller includes a digital filter comprising two cascaded second-order sections ("biquads"), which together can implement transfer functions for optimal cantilever controllers. An appendix in this report shows how to calculate filter coefficients for an optimal controller from measured cantilever characteristics. The controller also includes an input multiplexer and adder used in calibration protocols. Filter coefficients and multiplexer settings can be set and adjusted by control software while an experiment is running. The input is sampled at 64 MHz; the sampling frequency in the filters can be divided down under software control to achieve a good match with filter characteristics. Data reported here were sampled at 500 kHz, chosen for acoustic cantilevers with resonant frequencies near 8 kHz. Inputs are digitized with 12 bit resolution, and outputs are digitized with 14 bits. The experiment software is organized as a client and server to make it easy to adapt the controller to different experiments. The server encapsulates the details of controller hardware organization, connection technology, filter architecture, and number representation. The same server could be used in any experiment, while a different client encodes the particulars of each experiment.

  10. Temperature and non-linear response of cantilever-type mechanical oscillators used in atomic force microscopes with interferometric detection

    SciTech Connect

    Fläschner, G.; Ruschmeier, K.; Schwarz, A. Wiesendanger, R.; Bakhtiari, M. R.; Thorwart, M.

    2015-03-23

    The sensitivity of atomic force microscopes is fundamentally limited by the cantilever temperature, which can be, in principle, determined by measuring its thermal spectrum and applying the equipartition theorem. However, the mechanical response can be affected by the light field inside the cavity of a Fabry-Perot interferometer due to light absorption, radiation pressure, photothermal forces, and laser noise. By evaluating the optomechanical Hamiltonian, we are able to explain the peculiar distance dependence of the mechanical quality factor as well as the appearance of thermal spectra with symmetrical Lorentzian as well as asymmetrical Fano line shapes. Our results can be applied to any type of mechanical oscillator in an interferometer-based detection system.

  11. Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment.

    PubMed

    Nahavandi, Amir; Korayem, Moharam Habibnejad

    2015-10-01

    The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than d(on)), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a₀≤ d(ts) ≤ d(on), the capillary force is added to the Van der Waals force. At a distance of d(ts) ≤ a₀, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of h(c) which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position.

  12. Temperature dependence of viscosity and density of viscous liquids determined from thermal noise spectra of uncalibrated atomic force microscope cantilevers.

    PubMed

    McLoughlin, Neal; Lee, Stephen L; Hähner, Georg

    2007-08-01

    We demonstrate that the thermal response of uncalibrated atomic force microscope cantilevers can be used to extract the density and the viscosity of viscous liquids with good accuracy. Temperature dependent thermal noise spectra were measured in water/poly(ethylene glycol) mixtures. Empirical parameters characteristic of the resonance behavior of the system were extracted from data recorded for one of the solutions at room temperature. These parameters were then employed to determine both viscosity and density values of the solutions simultaneously at different temperatures. In addition, activation energies for viscous flow were determined from the viscosity values obtained. The method presented is both fast and reliable and has the potential to be applied in connection with microfluidic systems, making macroscopic amounts of liquid and separate measurements with a viscometer and a densimeter redundant.

  13. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner’s fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α{sub 3}β{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ∼7 frames/s.

  14. Analyzing the effect of the forces exerted on cantilever probe tip of atomic force microscope with tapering-shaped geometry and double piezoelectric extended layers in the air and liquid environments

    NASA Astrophysics Data System (ADS)

    Korayem, Moharam Habibnejad; Nahavandi, Amir

    2017-01-01

    The aim of the present study is to assess the force vibrational performance of tapering-shaped cantilevers, using Euler-Bernoulli theory. Tapering-shaped cantilevers have plan-view geometry consisting of a rectangular section at the clamped end and a triangular section at the tip. Hamilton's principle is utilized to obtain the partial differential equations governing the nonlinear vibration of the system as well as the corresponding boundary conditions. In this model, a micro cantilever, which is covered by two piezoelectric layers at the top and the bottom, is modeled at angle α. Both of these layers are subjected to similar AC and DC voltages. This paper attempts to determine the effect of the capillary force exerted on the cantilever probe tip of an atomic force microscope. The capillary force emerges due to the contact between thin water films with a thickness of hc which have accumulated on the sample and the probe. In addition, an attempt is made to develop the capillary force between the tip and the sample surface with respect to the geometry obtained. The smoothness or the roughness of the surfaces as well as the geometry of the cantilever tip have significant effects on the modeling of forces applied to the probe tip. In this article, the Van der Waals and the repulsive forces are considered to be the same in all of the simulations, and only is the capillary force altered in order to evaluate the role of this force in the atomic force microscope based modeling. We also indicate that the tip shape and the radial distance of the meniscus greatly influence the capillary force. The other objective of our study is to draw a comparison between tapering-and rectangular-shaped cantilevers. Furthermore, the equation for converting the tip of a tapering-shaped cantilever into a rectangular cantilever is provided. Moreover, the modal analysis method is employed to solve the motion equation. The mode shape function for the two tapering-shaped sections of the first

  15. Sensing mode atomic force microscope

    DOEpatents

    Hough, Paul V. C.; Wang, Chengpu

    2006-08-22

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  16. Sensing mode atomic force microscope

    DOEpatents

    Hough, Paul V.; Wang, Chengpu

    2004-11-16

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  17. Interlaboratory round robin on cantilever calibration for AFM force spectroscopy.

    PubMed

    te Riet, Joost; Katan, Allard J; Rankl, Christian; Stahl, Stefan W; van Buul, Arend M; Phang, In Yee; Gomez-Casado, Alberto; Schön, Peter; Gerritsen, Jan W; Cambi, Alessandra; Rowan, Alan E; Vancso, G Julius; Jonkheijm, Pascal; Huskens, Jurriaan; Oosterkamp, Tjerk H; Gaub, Hermann; Hinterdorfer, Peter; Figdor, Carl G; Speller, Sylvia

    2011-12-01

    Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs) strongly rely on accurately determined cantilever spring constants. Hence, to calibrate cantilevers, a reliable calibration protocol is essential. Although the thermal noise method and the direct Sader method are frequently used for cantilever calibration, there is no consensus on the optimal calibration of soft and V-shaped cantilevers, especially those used in force spectroscopy. Therefore, in this study we aimed at establishing a commonly accepted approach to accurately calibrate compliant and V-shaped cantilevers. In a round robin experiment involving eight different laboratories we compared the thermal noise and the Sader method on ten commercial and custom-built AFMs. We found that spring constants of both rectangular and V-shaped cantilevers can accurately be determined with both methods, although the Sader method proved to be superior. Furthermore, we observed that simultaneous application of both methods on an AFM proved an accurate consistency check of the instrument and thus provides optimal and highly reproducible calibration. To illustrate the importance of optimal calibration, we show that for biological force spectroscopy studies, an erroneously calibrated cantilever can significantly affect the derived (bio)physical parameters. Taken together, our findings demonstrated that with the pre-established protocol described reliable spring constants can be obtained for different types of cantilevers.

  18. Cantilevers orthodontics forces measured by fiber sensors

    NASA Astrophysics Data System (ADS)

    Schneider, Neblyssa; Milczewski, Maura S.; de Oliveira, Valmir; Guariza Filho, Odilon; Lopes, Stephani C. P. S.; Kalinowski, Hypolito J.

    2015-09-01

    Fibers Bragg Gratings were used to evaluate the transmission of the forces generates by orthodontic mechanic based one and two cantilevers used to move molars to the upright position. The results showed levels forces of approximately 0,14N near to the root of the molar with one and two cantilevers.

  19. Prototype cantilevers for quantitative lateral force microscopy

    SciTech Connect

    Reitsma, Mark G.; Gates, Richard S.; Friedman, Lawrence H.; Cook, Robert F.

    2011-09-15

    Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The ''hammerhead'' cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever ''torque sensitivity'' to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.

  20. Power spectrum analysis with least-squares fitting: amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers.

    PubMed

    Nørrelykke, Simon F; Flyvbjerg, Henrik

    2010-07-01

    Optical tweezers and atomic force microscope (AFM) cantilevers are often calibrated by fitting their experimental power spectra of Brownian motion. We demonstrate here that if this is done with typical weighted least-squares methods, the result is a bias of relative size between -2/n and +1/n on the value of the fitted diffusion coefficient. Here, n is the number of power spectra averaged over, so typical calibrations contain 10%-20% bias. Both the sign and the size of the bias depend on the weighting scheme applied. Hence, so do length-scale calibrations based on the diffusion coefficient. The fitted value for the characteristic frequency is not affected by this bias. For the AFM then, force measurements are not affected provided an independent length-scale calibration is available. For optical tweezers there is no such luck, since the spring constant is found as the ratio of the characteristic frequency and the diffusion coefficient. We give analytical results for the weight-dependent bias for the wide class of systems whose dynamics is described by a linear (integro)differential equation with additive noise, white or colored. Examples are optical tweezers with hydrodynamic self-interaction and aliasing, calibration of Ornstein-Uhlenbeck models in finance, models for cell migration in biology, etc. Because the bias takes the form of a simple multiplicative factor on the fitted amplitude (e.g. the diffusion coefficient), it is straightforward to remove and the user will need minimal modifications to his or her favorite least-squares fitting programs. Results are demonstrated and illustrated using synthetic data, so we can compare fits with known true values. We also fit some commonly occurring power spectra once-and-for-all in the sense that we give their parameter values and associated error bars as explicit functions of experimental power-spectral values.

  1. In-situ piezoresponse force microscopy cantilever mode shape profiling

    SciTech Connect

    Proksch, R.

    2015-08-21

    The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion, and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate sample. One notable conclusion is that a common choice of OBD spot location—at or near the tip of the cantilever—is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

  2. In-situ piezoresponse force microscopy cantilever mode shape profiling

    NASA Astrophysics Data System (ADS)

    Proksch, R.

    2015-08-01

    The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion, and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate sample. One notable conclusion is that a common choice of OBD spot location—at or near the tip of the cantilever—is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

  3. Piezoresistive cantilever force-clamp system

    SciTech Connect

    Park, Sung-Jin; Petzold, Bryan C.; Pruitt, Beth L.; Goodman, Miriam B.

    2011-04-15

    We present a microelectromechanical device-based tool, namely, a force-clamp system that sets or ''clamps'' the scaled force and can apply designed loading profiles (e.g., constant, sinusoidal) of a desired magnitude. The system implements a piezoresistive cantilever as a force sensor and the built-in capacitive sensor of a piezoelectric actuator as a displacement sensor, such that sample indentation depth can be directly calculated from the force and displacement signals. A programmable real-time controller operating at 100 kHz feedback calculates the driving voltage of the actuator. The system has two distinct modes: a force-clamp mode that controls the force applied to a sample and a displacement-clamp mode that controls the moving distance of the actuator. We demonstrate that the system has a large dynamic range (sub-nN up to tens of {mu}N force and nm up to tens of {mu}m displacement) in both air and water, and excellent dynamic response (fast response time, <2 ms and large bandwidth, 1 Hz up to 1 kHz). In addition, the system has been specifically designed to be integrated with other instruments such as a microscope with patch-clamp electronics. We demonstrate the capabilities of the system by using it to calibrate the stiffness and sensitivity of an electrostatic actuator and to measure the mechanics of a living, freely moving Caenorhabditis elegans nematode.

  4. Resonance response of scanning force microscopy cantilevers

    SciTech Connect

    Chen, G.Y.; Warmack, R.J.; Thundat, T.; Allison, D.P. ); Huang, A. )

    1994-08-01

    A variational method is used to calculate the deflection and the fundamental and harmonic resonance frequencies of commercial V-shaped and rectangular atomic force microscopy cantilevers. The effective mass of V-shaped cantilevers is roughly half that calculated for the equivalent rectangular cantilevers. Damping by environmental gases, including air, nitrogen, argon, and helium, affects the frequency of maximum response and to a much greater degree the quality factor [ital Q]. Helium has the lowest viscosity, resulting in the highest [ital Q], and thus provides the best sensitivity in noncontact force microscopy. Damping in liquids is dominated by an increase in effective mass of the cantilever due to an added mass of the liquid being dragged with that cantilever.

  5. Sensing mode atomic force microscope

    DOEpatents

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  6. Nonlinear Dynamics of Cantilever-Sample Interactions in Atomic Force Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The interaction of the cantilever tip of an atomic force microscope (AFM) with the sample surface is obtained by treating the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. The volume element is subjected to a restoring force from the remainder of the sample that provides dynamical equilibrium for the combined systems. The model accounts for the positions on the cantilever of the cantilever tip, laser probe, and excitation force (if any) via a basis set of set of orthogonal functions that may be generalized to account for arbitrary cantilever shapes. The basis set is extended to include nonlinear cantilever modes. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a matrix iteration procedure. The effects of oscillatory excitation forces applied either to the cantilever or to the sample surface (or to both) are obtained from the solution set and applied to the to the assessment of phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) modalities. The influence of bistable cantilever modes of on AFM signal generation is discussed. The effects on the cantilever-sample surface dynamics of subsurface features embedded in the sample that are perturbed by surface-generated oscillatory excitation forces and carried to the cantilever via wave propagation are accounted by the Bolef-Miller propagating wave model. Expressions pertaining to signal generation and image contrast in A-AFM are obtained and applied to amplitude modulation (intermittent contact) atomic force microscopy and resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM). The influence of phase accumulation in A-AFM on image contrast is discussed, as is the effect of hard contact and maximum nonlinearity regimes of A-AFM operation.

  7. Improved atomic force microscopy cantilever performance by partial reflective coating

    PubMed Central

    Miyahara, Yoichi; Aeschimann, Laure; Grütter, Peter

    2015-01-01

    Summary Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of the cantilever, leading to a lower mechanical quality factor (Q-factor). In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m) and stiff (≈28 N/m) rectangular cantilevers were used with a custom partial coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds. PMID:26199849

  8. Ultrasensitive Silicon Cantilever for Force Microscopy

    NASA Astrophysics Data System (ADS)

    Stowe, Timothy; Yasumura, Kevin; Thomas, Kenny; Daniel, Rugar

    1996-03-01

    A new type of ultrasensitive high Q scanning force probe has been developed which is capable of measuring forces smaller than 10-16 N in vacuum at a few degK. These single crystal silicon probes are 500 Åto 1700 Åthick and have in-plane tips with a radius of curvature under 90 nm. Because of their low spring constant (10-4 N/m) these cantilevers were placed normal to the sample surface thereby avoiding tip crashes due to snap in and were vibrated in the pendulum mode. Cantilever amplitude was detected using a fiber interferometer. Measurements of the Q vs. distance from sample surfaces in vacuum and nonlinear effects have been obtained. Measurements Q vs. temperature and ways of improving the Q will be discussed. This scanning force probe may be used to extend the spatial resolution and force sensitivity of Magnetic Resonance Force Microscopy. This research has been partially supported by the Fannie-Hertz Foundation.

  9. Resonant difference-frequency atomic force ultrasonic microscope

    NASA Technical Reports Server (NTRS)

    Cantrell, John H. (Inventor); Cantrell, Sean A. (Inventor)

    2010-01-01

    A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.

  10. Macroscopic model of scanning force microscope

    DOEpatents

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  11. Atomic Force Microscope

    SciTech Connect

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  12. Atomic Force Microscope Mediated Chromatography

    NASA Technical Reports Server (NTRS)

    Anderson, Mark S.

    2013-01-01

    The atomic force microscope (AFM) is used to inject a sample, provide shear-driven liquid flow over a functionalized substrate, and detect separated components. This is demonstrated using lipophilic dyes and normal phase chromatography. A significant reduction in both size and separation time scales is achieved with a 25-micron-length column scale, and one-second separation times. The approach has general applications to trace chemical and microfluidic analysis. The AFM is now a common tool for ultra-microscopy and nanotechnology. It has also been demonstrated to provide a number of microfluidic functions necessary for miniaturized chromatography. These include injection of sub-femtoliter samples, fluidic switching, and sheardriven pumping. The AFM probe tip can be used to selectively remove surface layers for subsequent microchemical analysis using infrared and tip-enhanced Raman spectroscopy. With its ability to image individual atoms, the AFM is a remarkably sensitive detector that can be used to detect separated components. These diverse functional components of microfluidic manipulation have been combined in this work to demonstrate AFM mediated chromatography. AFM mediated chromatography uses channel-less, shear-driven pumping. This is demonstrated with a thin, aluminum oxide substrate and a non-polar solvent system to separate a mixture of lipophilic dyes. In conventional chromatographic terms, this is analogous to thin-layer chromatography using normal phase alumina substrate with sheardriven pumping provided by the AFM tip-cantilever mechanism. The AFM detection of separated components is accomplished by exploiting the variation in the localized friction of the separated components. The AFM tip-cantilever provides the mechanism for producing shear-induced flows and rapid pumping. Shear-driven chromatography (SDC) is a relatively new concept that overcomes the speed and miniaturization limitations of conventional liquid chromatography. SDC is based on a

  13. Forced Vibrations of a Cantilever Beam

    ERIC Educational Resources Information Center

    Repetto, C. E.; Roatta, A.; Welti, R. J.

    2012-01-01

    The theoretical and experimental solutions for vibrations of a vertical-oriented, prismatic, thin cantilever beam are studied. The beam orientation is "downwards", i.e. the clamped end is above the free end, and it is subjected to a transverse movement at a selected frequency. Both the behaviour of the device driver and the beam's weak-damping…

  14. Atomic Force Microscope Operation

    NASA Technical Reports Server (NTRS)

    2008-01-01

    [figure removed for brevity, see original site] Click on image for animation (large file)

    This animation is a scientific illustration of the operation of NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

    The AFM is used to image the smallest Martian particles using a very sharp tip at the end of one of eight beams.

    The beam of the AFM is set into vibration and brought up to the surface of a micromachined silicon substrate. The substrate has etched in it a series of pits, 5 micrometers deep, designed to hold the Martian dust particles.

    The microscope then maps the shape of particles in three dimensions by scanning them with the tip.

    At the end of the animation is a 3D representation of the AFM image of a particle that was part of a sample informally called 'Sorceress.' The sample was delivered to the AFM on the 38th Martian day, or sol, of the mission (July 2, 2008).

    The image shows four round pits, only 5 microns in depth, that were micromachined into the silicon substrate.

    A Martian particle only one micrometer, or one millionth of a meter, across is held in the upper left pit.

    The rounded particle shown at the highest magnification ever seen from another world is a particle of the dust that cloaks Mars. Such dust particles color the Martian sky pink, feed storms that regularly envelop the planet and produce Mars' distinctive red soil.

    The AFM was developed by a Swiss-led consortium, with Imperial College London producing the silicon substrate that holds sampled particles.

    The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  15. Direct Measurement of Lateral Force Using Dual Cantilevers

    PubMed Central

    Ishikawa, Makoto; Ichikawa, Masaya; Miura, Kouji

    2012-01-01

    We have constructed an experimental system to measure a piconewton lateral force using dual cantilevers which cross with each other. The resolution of the lateral force is estimated to be 3.3 p ± 0.2 pN, which is comparable to forces due to thermal fluctuation. This experimental apparatus works so easily that it will enable us to determine forces during nano-manipulation and nano-tribological measurements. PMID:22737001

  16. Forced vibrations of a cantilever beam

    NASA Astrophysics Data System (ADS)

    Repetto, C. E.; Roatta, A.; Welti, R. J.

    2012-09-01

    The theoretical and experimental solutions for vibrations of a vertical-oriented, prismatic, thin cantilever beam are studied. The beam orientation is ‘downwards’, i.e. the clamped end is above the free end, and it is subjected to a transverse movement at a selected frequency. Both the behaviour of the device driver and the beam's weak-damping resonance response are compared for the case of an elastic beam made from PVC plastic excited over a frequency range from 1 to 30 Hz. The current analysis predicts the presence of ‘pseudo-nodes’ in the normal modes of oscillation. It is important to note that our results were obtained using very simple equipment, present in the teaching laboratory.

  17. Magnetostriction-driven cantilevers for dynamic atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Penedo, M.; Fernández-Martínez, I.; Costa-Krämer, J. L.; Luna, M.; Briones, F.

    2009-10-01

    An actuation mode is presented to drive the mechanical oscillation of cantilevers for dynamic atomic force microscopy. The method is based on direct mechanical excitation of the cantilevers coated with amorphous Fe-B-N thin films, by means of the film magnetostriction, i.e., the dimensional change in the film when magnetized. These amorphous magnetostrictive Fe-B-N thin films exhibit soft magnetic properties, excellent corrosion resistance in liquid environments, nearly zero accumulated stress when properly deposited, and good chemical stability. We present low noise and high resolution topographic images acquired in liquid environment to demonstrate the method capability.

  18. Shear force microscopy using piezoresistive cantilevers in surface metrology

    NASA Astrophysics Data System (ADS)

    Gotszalk, Teodor; Kopiec, Daniel; Sierakowski, Andrzej; Janus, Paweł; Grabiec, Piotr; Rangelow, Ivo W.

    2014-09-01

    In this article we describe application of piezoresistive cantilevers in surface investigations carried out with the use of shear force microscopy (ShFM). The novel piezoresistive cantilevers integrate a Wheatstone piezoresistive bridge was used to detect the cantilever deflection, thermal deflection detector and planar tip protruding out of the spring beam. Because the planar tip deflection can be detected and controlled electronically the described technology is very flexible and can be applied in many surface investigations. In this article we will present operation theory of the described solution, experimental setup, methods for calibration of the tip deflection detection and actuation The analysis will be illustrated with example results of topography measurements performed using the described technology.

  19. Precise and direct method for the measurement of the torsion spring constant of the atomic force microscopy cantilevers

    SciTech Connect

    Jarząbek, D. M.

    2015-01-15

    A direct method for the evaluation of the torsional spring constants of the atomic force microscope cantilevers is presented in this paper. The method uses a nanoindenter to apply forces at the long axis of the cantilever and in the certain distance from it. The torque vs torsion relation is then evaluated by the comparison of the results of the indentations experiments at different positions on the cantilever. Next, this relation is used for the precise determination of the torsional spring constant of the cantilever. The statistical analysis shows that the standard deviation of the calibration measurements is equal to approximately 1%. Furthermore, a simple method for calibration of the photodetector’s lateral response is proposed. The overall procedure of the lateral calibration constant determination has the accuracy approximately equal to 10%.

  20. Measuring and Understanding Forces on Atomic Length Scales with the Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Cleveland, Jason Paul

    Most microscopes can be used with little understanding of how they work--much can be learned looking through a light microscope without ever knowing what a photon is or who Maxwell was--and the Atomic Force Microscope (AFM) is no exception. Many AFM images don't look much different from a mountainous landscape, and much is learned interpreting them as such; however, to really push a microscope to its limits means understanding the interactions creating the contrast in the picture. For a Scanning Electron Microscope, this means understanding how electrons interact with matter, for an AFM it means understanding forces. The focus of this thesis is understanding the forces acting (especially in liquids) between tip and sample in AFM and a better understanding the instrument itself. Chapters I, II and VI involve better characterizing and improving the most important part of the AFM, the tiny cantilever used to measure forces. Chapter I describes a solution to one of the most basic problems that must be solved before forces can be accurately measured--measuring the stiffness of these cantilevers. Many limitations in AFM are set by physical characteristics of the cantilever itself, such as resonance frequency, spring constant, and quality factor. If an external force can be applied to the cantilever, feedback can be used to improve these characteristics. Chapter II shows how to do this using a magnetically applied external force, which has the advantage of working in liquids. These physical characteristics also change drastically when the cantilever is immersed in fluid. The resonance frequency of common cantilevers drops by as much as a factor of six in going from air to water. Chapter VI studies these changes and shows how further miniaturization of cantilevers can improve imaging speeds and signal-to-noise ratio. Early in its career, the AFM was heralded as having atomic resolution, but as the field matured researchers realized that the contact area between tip and

  1. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

    PubMed Central

    Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    Summary We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm3 is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm3. In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. PMID:25821686

  2. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans.

    PubMed

    Meier, Tobias; Förste, Alexander; Tavassolizadeh, Ali; Rott, Karsten; Meyners, Dirk; Gröger, Roland; Reiss, Günter; Quandt, Eckhard; Schimmel, Thomas; Hölscher, Hendrik

    2015-01-01

    We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm(3) is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm(3). In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers.

  3. Laser Actuation of Cantilevers for Picometre Amplitude Dynamic Force Microscopy

    PubMed Central

    Evans, Drew R.; Tayati, Ponlawat; An, Hongjie; Lam, Ping Koy; Craig, Vincent S. J.; Senden, Tim J.

    2014-01-01

    As nanoscale and molecular devices become reality, the ability to probe materials on these scales is increasing in importance. To address this, we have developed a dynamic force microscopy technique where the flexure of the microcantilever is excited using an intensity modulated laser beam to achieve modulation on the picoscale. The flexure arises from thermally induced bending through differential expansion and the conservation of momentum when the photons are reflected and absorbed by the cantilever. In this study, we investigated the photothermal and photon pressure responses of monolithic and layered cantilevers using a modulated laser in air and immersed in water. The developed photon actuation technique is applied to the stretching of single polymer chains. PMID:24993548

  4. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Fukuma, Takeshi; Kimura, Masayuki; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

    2005-05-01

    We have developed a low noise cantilever deflection sensor with a deflection noise density of 17fm/√Hz by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.

  5. Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

    SciTech Connect

    Fukuma, Takeshi; Kimura, Masayuki; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

    2005-05-15

    We have developed a low noise cantilever deflection sensor with a deflection noise density of 17 fm/{radical}(Hz) by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.

  6. Magnetic Resonance Force Microscope Development

    SciTech Connect

    Hammel, P.C.; Zhang, Z.; Suh, B.J.; Roukes, M.L.; Midzor, M.; Wigen, P.E.; Childress, J.R.

    1999-06-03

    Our objectives were to develop the Magnetic Resonance Force Microscope (MRFM) into an instrument capable of scientific studies of buried structures in technologically and scientifically important electronic materials such as magnetic multilayer materials. This work resulted in the successful demonstration of MRFM-detected ferromagnetic resonance (FMR) as a microscopic characterization tool for thin magnetic films. Strong FMR spectra obtained from microscopic Co thin films (500 and 1000 angstroms thick and 40 x 200 microns in lateral extent) allowed us to observe variations in sample inhomogeneity and magnetic anisotropy field. We demonstrated lateral imaging in microscopic FMR for the first time using a novel approach employing a spatially selective local field generated by a small magnetically polarized spherical crystallite of yttrium iron garnet. These successful applications of the MRFM in materials studies provided the basis for our successful proposal to DOE/BES to employ the MRF M in studies of buried interfaces in magnetic materials.

  7. Implementation of Akiyama probe in low temperature magnetic force microscope

    NASA Astrophysics Data System (ADS)

    Sass, Paul; Wu, Weida

    Exotic phenomena often call for high sensitivity scanning probe microscopic techniques working at extremely low temperatures. Specifically, it is of great fundamental interest to detect the weak magnetic signals in a range of interesting systems such as, quantum anomalous Hall, skyrmion, heavy-fermion, and multiferroic systems. To this end, we are developing low temperature magnetic force microscope (MFM) using a self-sensing cantilever called Akiyama-probe (A-probe). The main advantage of this specific probe is its extremely low power-dissipation compared to other self-sensing (e.g. piezoresistive) cantilevers for low temperature application. We will present progress of the implementation of A-probe and preliminary results under various conditions. This work is supported by DOE BES under Award DE-SC0008147.

  8. Electric force microscopy of semiconductors: theory of cantilever frequency fluctuations and noncontact friction.

    PubMed

    Lekkala, Swapna; Marohn, John A; Loring, Roger F

    2013-11-14

    An electric force microscope employs a charged atomic force microscope probe in vacuum to measure fluctuating electric forces above the sample surface generated by dynamics of molecules and charge carriers. We present a theoretical description of two observables in electric force microscopy of a semiconductor: the spectral density of cantilever frequency fluctuations (jitter), which are associated with low-frequency dynamics in the sample, and the coefficient of noncontact friction, induced by higher-frequency motions. The treatment is classical-mechanical, based on linear response theory and classical electrodynamics of diffusing charges in a dielectric continuum. Calculations of frequency jitter explain the absence of contributions from carrier dynamics to previous measurements of an organic field effect transistor. Calculations of noncontact friction predict decreasing friction with increasing carrier density through the suppression of carrier density fluctuations by intercarrier Coulomb interactions. The predicted carrier density dependence of the friction coefficient is consistent with measurements of the dopant density dependence of noncontact friction over Si. Our calculations predict that in contrast to the measurement of cantilever frequency jitter, a noncontact friction measurement over an organic semiconductor could show appreciable contributions from charge carriers.

  9. Electric force microscopy of semiconductors: Theory of cantilever frequency fluctuations and noncontact friction

    SciTech Connect

    Lekkala, Swapna; Marohn, John A.; Loring, Roger F.

    2013-11-14

    An electric force microscope employs a charged atomic force microscope probe in vacuum to measure fluctuating electric forces above the sample surface generated by dynamics of molecules and charge carriers. We present a theoretical description of two observables in electric force microscopy of a semiconductor: the spectral density of cantilever frequency fluctuations (jitter), which are associated with low-frequency dynamics in the sample, and the coefficient of noncontact friction, induced by higher-frequency motions. The treatment is classical-mechanical, based on linear response theory and classical electrodynamics of diffusing charges in a dielectric continuum. Calculations of frequency jitter explain the absence of contributions from carrier dynamics to previous measurements of an organic field effect transistor. Calculations of noncontact friction predict decreasing friction with increasing carrier density through the suppression of carrier density fluctuations by intercarrier Coulomb interactions. The predicted carrier density dependence of the friction coefficient is consistent with measurements of the dopant density dependence of noncontact friction over Si. Our calculations predict that in contrast to the measurement of cantilever frequency jitter, a noncontact friction measurement over an organic semiconductor could show appreciable contributions from charge carriers.

  10. A compact vertical scanner for atomic force microscopes.

    PubMed

    Park, Jae Hong; Shim, Jaesool; Lee, Dong-Yeon

    2010-01-01

    A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scanner's performance, experiments are performed to evaluate the travel range, resonance frequency, and feedback noise level. In addition, an AFM image using the proposed vertical scanner is generated.

  11. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    SciTech Connect

    Labuda, Aleksander; Proksch, Roger

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  12. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    NASA Astrophysics Data System (ADS)

    Labuda, Aleksander; Proksch, Roger

    2015-06-01

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  13. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    SciTech Connect

    Karcı, Özgür; Dede, Münir

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/√Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  14. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    NASA Astrophysics Data System (ADS)

    Karcı, Özgür; Dede, Münir; Oral, Ahmet

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ˜12 fm/√Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  15. High-speed atomic force microscope based on an astigmatic detection system

    NASA Astrophysics Data System (ADS)

    Liao, H.-S.; Chen, Y.-H.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Hwu, E.-T.; Huang, K.-Y.; Chang, C.-S.; Hwang, I.-S.

    2014-10-01

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  16. High-speed atomic force microscope based on an astigmatic detection system

    SciTech Connect

    Liao, H.-S.; Chen, Y.-H.; Hwu, E.-T.; Chang, C.-S.; Hwang, I.-S.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Huang, K.-Y.

    2014-10-15

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  17. Analyzing the vibrational response of an AFM cantilever in liquid with the consideration of tip mass by comparing the hydrodynamic and contact repulsive force models in higher modes

    NASA Astrophysics Data System (ADS)

    Korayem, Moharam Habibnejad; Nahavandi, Amir

    2017-04-01

    This paper investigates the vibration of a tapping-mode Atomic Force Microscope (AFM) cantilever covered with two whole piezoelectric layers in a liquid medium. The authors of this article have already modeled the vibration of a cantilever immersed in liquid over rough surfaces. Five new ideas have been considered for improving the results of the previous work. Mass and damping of a cantilever probe tip have been considered. Since the probe tip of an AFM cantilever has a mass, which can itself affect the natural frequency of vibration, the significance of this mass has been explored. Also, two hydrodynamic force models for analyzing the mass and damping added to a cantilever in liquid medium have been evaluated. In modeling the vibration of a cantilever in liquid, simplifications are made to the theoretical equations used in the modeling, which may make the obtained results different from those in the real case. So, two hydrodynamic force models are introduced and compared with each other. In addition to the already introduced DMT model, the JKR model has been proposed. The forces acting on a probe tip have attractive and repulsive effects. The attractive Van der Waals force can vary depending on the surface smoothness or roughness, and the repulsive contact force, which is independent of the type of surface roughness and usually varies with the hardness or softness of a surface. When the first mode is used in the vibration of an AFM cantilever, the changes of the existing physical parameters in the simulation do not usually produce a significant difference in the response. Thus, three cantilever vibration modes have been investigated. Finally, an analytical approach for obtaining the response of equations is presented which solves the resulting motion equation by the Laplace method and, thus, a time function is obtained for cantilever deflection is determined. Also, using the COMSOL software to model a cantilever in a liquid medium, the computed natural

  18. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect

    Balantekin, M.; Satır, S.; Torello, D.; Değertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  19. Hyperbaric hydrothermal atomic force microscope

    DOEpatents

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  20. Hyperbaric Hydrothermal Atomic Force Microscope

    DOEpatents

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2003-07-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  1. Silicon cantilever functionalization for cellulose-specific chemical force imaging of switchgrass

    DOE PAGES

    Lee, Ida; Evans, Barbara R.; Foston, Marcus B.; ...

    2015-05-08

    A method for direct functionalization of silicon and silicon nitride cantilevers with bifunctional silanes was tested with model surfaces to determine adhesive forces for different hydrogen-bonding chemistries. Application for biomass surface characterization was tested by mapping switchgrass and isolated switchgrass cellulose in topographic and force-volume mode using a cellulose-specific cantilever.

  2. High bandwidth deflection readout for atomic force microscopes.

    PubMed

    Steininger, Juergen; Bibl, Matthias; Yoo, Han Woong; Schitter, Georg

    2015-10-01

    This contribution presents the systematic design of a high bandwidth deflection readout mechanism for atomic force microscopes. The widely used optical beam deflection method is revised by adding a focusing lens between the cantilever and the quadrant photodetector (QPD). This allows the utilization of QPDs with a small active area resulting in an increased detection bandwidth due to the reduced junction capacitance. Furthermore the additional lens can compensate a cross talk between a compensating z-movement of the cantilever and the deflection readout. Scaling effects are analyzed to get the optimal spot size for the given geometry of the QPD. The laser power is tuned to maximize the signal to noise ratio without limiting the bandwidth by local saturation effects. The systematic approach results in a measured -3 dB detection bandwidth of 64.5 MHz at a deflection noise density of 62fm/√Hz.

  3. A calibration method for lateral forces for use with colloidal probe force microscopy cantilevers

    SciTech Connect

    Quintanilla, M. A. S.; Goddard, D. T.

    2008-02-15

    A calibration method is described for colloidal probe cantilevers that enables friction force measurements obtained using lateral force microscopy (LFM) to be quantified. The method is an adaptation of the lever method of Feiler et al. [A. Feiler, P. Attard, and I. Larson, Rev. Sci. Instum. 71, 2746 (2000)] and uses the advantageous positioning of probe particles that are usually offset from the central axis of the cantilever. The main sources of error in the calibration method are assessed, in particular, the potential misalignment of the long axis of the cantilever that ideally should be perpendicular to the photodiode detector. When this is not taken into account, the misalignment is shown to have a significant effect on the cantilever torsional stiffness but not on the lateral photodiode sensitivity. Also, because the friction signal is affected by the topography of the substrate, the method presented is valid only against flat substrates. Two types of particles, 20 {mu}m glass beads and UO{sub 3} agglomerates attached to silicon tapping mode cantilevers were used to test the method against substrates including glass, cleaved mica, and UO{sub 2} single crystals. Comparisons with the lateral compliance method of Cain et al. [R. G. Cain, S. Biggs, and N. W. Page, J. Colloid Interface Sci. 227, 55 (2000)] are also made.

  4. Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulation.

    PubMed

    Korayem, Moharam Habibnejad; Saraie, Maniya B; Saraee, Mahdieh B

    2017-01-13

    An important challenge when using an atomic force microscope (AFM) is to be able to control the force exerted by the AFM for performing various tasks. Nevertheless, the exerted force is proportional to the deflection of the AFM cantilever, which itself is affected by a cantilever's stiffness coefficient. Many papers have been published so far on the methods of obtaining the stiffness coefficients of AFM cantilevers in 2D; however, a comprehensive model is yet to be presented on 3D cantilever motion. The discrepancies between the equations of the 2D and 3D analysis are due to the number and direction of forces and moments that are applied to a cantilever. Moreover, in the 3D analysis, contrary to the 2D analysis, due to the interaction between the forces and moments applied on a cantilever, its stiffness values cannot be separately expressed for each direction; and instead, a stiffness matrix should be used to correctly derive the relevant equations. In this paper, 3D stiffness coefficient matrices have been obtained for three common cantilever geometries including the rectangular, V-shape and dagger-shape cantilevers. The obtained equations are validated by two methods. In the first approach, the Finite Element Method is combined with the cantilever deflection values computed by using the obtained stiffness matrices. In the second approach, by reducing the problem's parameters, the forces applied on a cantilever along different directions are compared with each other in 2D and 3D cases. Then the 3D manipulation of a stiff nanoparticle is modeled and simulated by using the stiffness matrices obtained for the three cantilever geometries. The obtained results indicate that during the manipulation process, the dagger-shaped and rectangular cantilevers exert the maximum and minimum amounts of forces on the stiff nanoparticle, respectively. Also, by examining the effects of different probe tip geometries, it is realized that a probe tip of cylindrical geometry exerts the

  5. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy.

    PubMed

    Loganathan, Muthukumaran; Bristow, Douglas A

    2014-04-01

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  6. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  7. Manipulation of cadmium selenide nanorods with an atomic force microscope.

    PubMed

    Tranvouez, E; Orieux, A; Boer-Duchemin, E; Devillers, C H; Huc, V; Comtet, G; Dujardin, G

    2009-04-22

    We have used an atomic force microscope (AFM) to manipulate and study ligand-capped cadmium selenide nanorods deposited on highly oriented pyrolitic graphite (HOPG). The AFM tip was used to manipulate (i.e., translate and rotate) the nanorods by applying a force perpendicular to the nanorod axis. The manipulation result was shown to depend on the point of impact of the AFM tip with the nanorod and whether the nanorod had been manipulated previously. Forces applied parallel to the nanorod axis, however, did not give rise to manipulation. These results are interpreted by considering the atomic-scale interactions of the HOPG substrate with the organic ligands surrounding the nanorods. The vertical deflection of the cantilever was recorded during manipulation and was combined with a model in order to estimate the value of the horizontal force between the tip and nanorod during manipulation. This horizontal force is estimated to be on the order of a few tens of nN.

  8. Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry.

    PubMed

    Gysin, U; Rast, S; Kisiel, M; Werle, C; Meyer, E

    2011-02-01

    A noncontact atomic force microscope (nc-AFM) operating in magnetic fields up to ±7 T and liquid helium temperatures is presented in this article. In many common AFM experiments the cantilever is mounted parallel to the sample surface, while in our system the cantilever is assembled perpendicular to it; the so called pendulum mode of AFM operation. In this mode measurements employing very soft and, therefore, ultrasensitive cantilevers can be performed. The ultrahigh vacuum conditions allow to prepare and transfer cantilevers and samples in a requested manner avoiding surface contamination. We demonstrate the possibility of nc-AFM and Kelvin force probe microscopy imaging in the pendulum mode. Ultrasensitive experiments on small spin ensembles are presented as well.

  9. Spatial spectrograms of vibrating atomic force microscopy cantilevers coupled to sample surfaces

    SciTech Connect

    Wagner, Ryan; Raman, Arvind; Proksch, Roger

    2013-12-23

    Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact resonance, force modulation, piezoresponse force microscopy, electrochemical strain microscopy, and AFM infrared spectroscopy exploit the dynamic response of a cantilever in contact with a sample to extract local material properties. Achieving quantitative results in these techniques usually requires the assumption of a certain shape of cantilever vibration. We present a technique that allows in-situ measurements of the vibrational shape of AFM cantilevers coupled to surfaces. This technique opens up unique approaches to nanoscale material property mapping, which are not possible with single point measurements alone.

  10. Analytical Model of the Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions for Various Acoustic-Atomic Force Microscopies

    NASA Technical Reports Server (NTRS)

    Cantrell, John H., Jr.; Cantrell, Sean A.

    2008-01-01

    A comprehensive analytical model of the interaction of the cantilever tip of the atomic force microscope (AFM) with the sample surface is developed that accounts for the nonlinearity of the tip-surface interaction force. The interaction is modeled as a nonlinear spring coupled at opposite ends to linear springs representing cantilever and sample surface oscillators. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a standard iteration procedure. Solutions are obtained for the phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) techniques including force modulation microscopy, atomic force acoustic microscopy, ultrasonic force microscopy, heterodyne force microscopy, resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), and the commonly used intermittent contact mode (TappingMode) generally available on AFMs. The solutions are used to obtain a quantitative measure of image contrast resulting from variations in the Young modulus of the sample for the amplitude and phase images generated by the A-AFM techniques. Application of the model to RDF-AFUM and intermittent soft contact phase images of LaRC-cp2 polyimide polymer is discussed. The model predicts variations in the Young modulus of the material of 24 percent from the RDF-AFUM image and 18 percent from the intermittent soft contact image. Both predictions are in good agreement with the literature value of 21 percent obtained from independent, macroscopic measurements of sheet polymer material.

  11. Optical lever calibration in atomic force microscope with a mechanical lever.

    PubMed

    Xie, Hui; Vitard, Julien; Haliyo, Sinan; Régnier, Stéphane

    2008-09-01

    A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an accurate conversion between the photodiode voltage output and torsional angle of a cantilever. During the calibration, the cantilever is mounted on a holder attached on the lever, which brings the torsional axis of the cantilever and rotation axis of the lever into line. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range lateral sensitivity calibrations of the optical lever without modifying the actual AFM or the cantilevers.

  12. Combined scanning tunneling and force microscope with fuzzy controlled feedback

    NASA Astrophysics Data System (ADS)

    Battiston, F. M.; Bammerlin, M.; Loppacher, Ch.; Guggisberg, M.; Lüthi, R.; Meyer, E.; Eggimann, F.; Güntherodt, H.-J.

    Decision-making logic based on fuzzy logic and an adaptive PI-controller was inserted into the feedback loop of a combined atomic force microscope/scanning tunneling microscope (AFM/STM), which is able to measure the frequency shift Δf of the cantilever-type spring and the mean tunneling current t simultanously. Depending on the conductivity of the surface the fuzzy logic controller decides whether it has to use the AFM feedback or the STM feedback. On conductive regions of the sample STM mode is used, whereas on poorly conducting regions the non-contact AFM mode is preferred. This allows one to scan over heterogenous surfaces avoiding a tip crash.

  13. Detection of atomic force microscopy cantilever displacement with a transmitted electron beam.

    PubMed

    Wagner, R; Woehl, T J; Keller, R R; Killgore, J P

    2016-07-25

    The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detection scheme for measuring AFM cantilever oscillations. The oscillating AFM tip is positioned perpendicular to and in the path of a stationary focused nanometer sized electron beam. As the tip oscillates, the thickness of the material under the electron beam changes, causing a fluctuation in the number of scattered transmitted electrons that are detected. We demonstrate detection of sub-nanometer vibration amplitudes with an electron beam, providing a pathway for dynamic AFM with cantilevers that are orders of magnitude smaller and faster than the current state of the art.

  14. Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

    NASA Astrophysics Data System (ADS)

    Wagner, R.; Woehl, T. J.; Keller, R. R.; Killgore, J. P.

    2016-07-01

    The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detection scheme for measuring AFM cantilever oscillations. The oscillating AFM tip is positioned perpendicular to and in the path of a stationary focused nanometer sized electron beam. As the tip oscillates, the thickness of the material under the electron beam changes, causing a fluctuation in the number of scattered transmitted electrons that are detected. We demonstrate detection of sub-nanometer vibration amplitudes with an electron beam, providing a pathway for dynamic AFM with cantilevers that are orders of magnitude smaller and faster than the current state of the art.

  15. Selective nano-patterning of graphene using a heated atomic force microscope tip

    SciTech Connect

    Choi, Young-Soo; Wu, Xuan; Lee, Dong-Weon

    2014-04-15

    In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 μm/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO{sub 2} layer, with a tip contact force of 100 nN.

  16. Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity

    NASA Astrophysics Data System (ADS)

    Vakarelski, Ivan U.; Edwards, Scott A.; Dagastine, Raymond R.; Chan, Derek Y. C.; Stevens, Geoffrey W.; Grieser, Franz

    2007-11-01

    A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85μm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.

  17. Atomic force microscopy: loading position dependence of cantilever spring constants and detector sensitivity.

    PubMed

    Vakarelski, Ivan U; Edwards, Scott A; Dagastine, Raymond R; Chan, Derek Y C; Stevens, Geoffrey W; Grieser, Franz

    2007-11-01

    A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 microm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.

  18. Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy.

    SciTech Connect

    Choi, H.; Hong, S.; No, K.

    2011-01-01

    A simple quantitative measurement procedure of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy is presented. This technique enables one to determine the corresponding lateral inverse optical lever sensitivity (LIOLS) of the cantilever on the given sample. Piezoelectric coefficient, d{sub 31} of BaTiO{sub 3} single crystal (-81.62 {+-} 40.22 pm/V) which was calculated using the estimated LIOLS was in good agreement with the reported value in literature.

  19. Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy

    NASA Astrophysics Data System (ADS)

    Choi, Hyunwoo; Hong, Seungbum; No, Kwangsoo

    2011-11-01

    A simple quantitative measurement procedure of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy is presented. This technique enables one to determine the corresponding lateral inverse optical lever sensitivity (LIOLS) of the cantilever on the given sample. Piezoelectric coefficient, d31 of BaTiO3 single crystal (-81.62 ± 40.22 pm/V) which was calculated using the estimated LIOLS was in good agreement with the reported value in literature.

  20. Silicon cantilever sensor for micro-/nanoscale dimension and force metrology

    NASA Astrophysics Data System (ADS)

    Peiner, Erwin; Doering, Lutz; Balke, Michael; Christ, Andreas

    2007-05-01

    A piezoresistive silicon cantilever-type tactile sensor was described as well as its application for dimensional metrology with micro components and as a transferable force standard in the micro-to-nano Newton range. As an example for tactile probing metrology the novel cantilever sensor was used for surface scanning with calibrated groove and roughness artifacts. Force metrology was addressed based on calibration procedures which were developed for commercial stylus instruments as well as for glass pipettes designed for the characterization of the vital forces of isolated cells.

  1. MIDAS: Lessons learned from the first spaceborne atomic force microscope

    NASA Astrophysics Data System (ADS)

    Bentley, Mark Stephen; Arends, Herman; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

    2016-08-01

    The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of tip geometries.

  2. Electrothermally driven high-frequency piezoresistive SiC cantilevers for dynamic atomic force microscopy

    SciTech Connect

    Boubekri, R.; Cambril, E.; Couraud, L.; Bernardi, L.; Madouri, A.; Portail, M.; Chassagne, T.; Moisson, C.; Zielinski, M.; Jiao, S.; Michaud, J.-F.; Alquier, D.; Bouloc, J.; Nony, L.; Bocquet, F.; Loppacher, C.

    2014-08-07

    Cantilevers with resonance frequency ranging from 1 MHz to 100 MHz have been developed for dynamic atomic force microscopy. These sensors are fabricated from 3C-SiC epilayers grown on Si(100) substrates by low pressure chemical vapor deposition. They use an on-chip method both for driving and sensing the displacement of the cantilever. A first gold metallic loop deposited on top of the cantilever is used to drive its oscillation by electrothermal actuation. The sensing of this oscillation is performed by monitoring the resistance of a second Au loop. This metallic piezoresistive detection method has distinct advantages relative to more common semiconductor-based schemes. The optimization, design, fabrication, and characteristics of these cantilevers are discussed.

  3. High-speed atomic force microscope combined with single-molecule fluorescence microscope

    NASA Astrophysics Data System (ADS)

    Fukuda, Shingo; Uchihashi, Takayuki; Iino, Ryota; Okazaki, Yasutaka; Yoshida, Masato; Igarashi, Kiyohiko; Ando, Toshio

    2013-07-01

    High-speed atomic force microscopy (HS-AFM) and total internal reflection fluorescence microscopy (TIRFM) have mutually complementary capabilities. Here, we report techniques to combine these microscopy systems so that both microscopy capabilities can be simultaneously used in the full extent. To combine the two systems, we have developed a tip-scan type HS-AFM instrument equipped with a device by which the laser beam from the optical lever detector can track the cantilever motion in the X- and Y-directions. This stand-alone HS-AFM system is mounted on an inverted optical microscope stage with a wide-area scanner. The capability of this combined system is demonstrated by simultaneous HS-AFM/TIRFM imaging of chitinase A moving on a chitin crystalline fiber and myosin V walking on an actin filament.

  4. High-speed atomic force microscope combined with single-molecule fluorescence microscope.

    PubMed

    Fukuda, Shingo; Uchihashi, Takayuki; Iino, Ryota; Okazaki, Yasutaka; Yoshida, Masato; Igarashi, Kiyohiko; Ando, Toshio

    2013-07-01

    High-speed atomic force microscopy (HS-AFM) and total internal reflection fluorescence microscopy (TIRFM) have mutually complementary capabilities. Here, we report techniques to combine these microscopy systems so that both microscopy capabilities can be simultaneously used in the full extent. To combine the two systems, we have developed a tip-scan type HS-AFM instrument equipped with a device by which the laser beam from the optical lever detector can track the cantilever motion in the X- and Y-directions. This stand-alone HS-AFM system is mounted on an inverted optical microscope stage with a wide-area scanner. The capability of this combined system is demonstrated by simultaneous HS-AFM∕TIRFM imaging of chitinase A moving on a chitin crystalline fiber and myosin V walking on an actin filament.

  5. A subsurface add-on for standard atomic force microscopes.

    PubMed

    Verbiest, G J; van der Zalm, D J; Oosterkamp, T H; Rost, M J

    2015-03-01

    The application of ultrasound in an Atomic Force Microscope (AFM) gives access to subsurface information. However, no commercially AFM exists that is equipped with this technique. The main problems are the electronic crosstalk in the AFM setup and the insufficiently strong excitation of the cantilever at ultrasonic (MHz) frequencies. In this paper, we describe the development of an add-on that provides a solution to these problems by using a special piezo element with a lowest resonance frequency of 2.5 MHz and by separating the electronic connection for this high frequency piezo element from all other connections. In this sense, we support researches with the possibility to perform subsurface measurements with their existing AFMs and hopefully pave also the way for the development of a commercial AFM that is capable of imaging subsurface features with nanometer resolution.

  6. A subsurface add-on for standard atomic force microscopes

    SciTech Connect

    Verbiest, G. J.; Zalm, D. J. van der; Oosterkamp, T. H.; Rost, M. J.

    2015-03-15

    The application of ultrasound in an Atomic Force Microscope (AFM) gives access to subsurface information. However, no commercially AFM exists that is equipped with this technique. The main problems are the electronic crosstalk in the AFM setup and the insufficiently strong excitation of the cantilever at ultrasonic (MHz) frequencies. In this paper, we describe the development of an add-on that provides a solution to these problems by using a special piezo element with a lowest resonance frequency of 2.5 MHz and by separating the electronic connection for this high frequency piezo element from all other connections. In this sense, we support researches with the possibility to perform subsurface measurements with their existing AFMs and hopefully pave also the way for the development of a commercial AFM that is capable of imaging subsurface features with nanometer resolution.

  7. Gating mechanosensitive channels in bacteria with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Garces, Renata; Miller, Samantha; Schmidt, Christoph F.; Third Institute of Physics Team; School of Medical Sciences Collaboration

    The regulation of growth and integrity of bacteria is critically linked to mechanical stress. Bacteria typically maintain a high difference of osmotic pressure (turgor pressure) with respect to the environment. This pressure difference (on the order of 1 atm) is supported by the cell envelope, a composite of lipid membranes and a rigid cell wall. Turgor pressure is controlled by the ratio of osmolytes inside and outside bacteria and thus, can abruptly increase upon osmotic downshock. For structural integrity bacteria rely on the mechanical stability of the cell wall and on the action of mechanosensitive (MS) channels: membrane proteins that release solutes in response to stress in the cell envelope. We here present experimental data on MS channels gating. We activate channels by indenting living bacteria with the cantilever of an atomic force microscope (AFM). We compare responses of wild-type and mutant bacteria in which some or all MS channels have been eliminated.

  8. Harmonic force microscope: A new tool for biomolecular identification and material characterization based on nanomechanical measurements

    NASA Astrophysics Data System (ADS)

    Sahin, Ozgur

    At the molecular level, physical and chemical properties of materials are tightly coupled to the mechanical properties. The potential of mechanics for interacting with matter at the nanoscale has been largely unexplored due to lack of instruments capable of performing mechanical measurements at nanometer length scales. This thesis describes nanomechanical sensing techniques and applications based on time-resolved tip-sample force measurements in tapping-mode atomic force microscopy. Tapping mode is the most successful operation mode of atomic force microscopes. Theoretical calculations presented in the first part of this thesis show that time variations of the tip-sample forces in the tapping-mode depend on the physical and chemical properties of the sample and therefore, have the potential to be used for nanomechanical measurements. Unfortunately, the force-sensing probe of the tapping-mode atomic force microscope, the vibrating cantilever, is limited in its response to the variations of forces in time within a period of oscillations. We are describing two types of special micromachined cantilevers that enable measurements of time variations of tip-sample forces: the harmonic cantilever and the coupled torsional cantilever. These special cantilevers allow sensitive mechanical measurements at the nanoscale and single molecular level. The operation of these cantilevers does not require any modifications to the existing atomic force microscopy systems. With the nanomechanical sensing techniques we have developed, we investigated phase transformations of sub-micron domains of composite polymers and observed their glass transitions for the first time. Conventional measurements on bulk properties of these samples do not provide information on the physical changes at the nanoscale. Studies on nucleic acids attached to a surface, a configuration commonly used in DNA microarray technology, showed that the hybridized DNA molecules can be detected at the single molecule

  9. Flexural Vibration Test of a Cantilever Beam with a Force Sensor: Fast Determination of Young's Modulus

    ERIC Educational Resources Information Center

    Digilov, Rafael M.

    2008-01-01

    We describe a simple and very inexpensive undergraduate laboratory experiment for fast determination of Young's modulus at moderate temperatures with the aid of a force sensor. A strip-shaped specimen rigidly bolted to the force sensor forms a clamped-free cantilever beam. Placed in a furnace, it is subjected to free-bending vibrations followed by…

  10. Design and calibration of a scanning force microscope for friction, adhesion, and contact potential studies

    NASA Astrophysics Data System (ADS)

    Koleske, D. D.; Lee, G. U.; Gans, B. I.; Lee, K. P.; DiLella, D. P.; Wahl, K. J.; Barger, W. R.; Whitman, L. J.; Colton, R. J.

    1995-09-01

    We present the design and calibration of a scanning force microscope which can be used to study friction, adhesion, and contact potential differences between the cantilever tip and surface. The microscope uses a modular design where the laser, cantilever/sample holder, reflecting mirror, and detector are mounted directly on an optical table. The laser, reflecting mirror, and detector are mounted on translation and rotation stages. With this design the components can be rearranged to calibrate the Z piezo motion as a function of applied voltage. Using the detector micrometers, the detector response (voltage-to-distance relationship) can be determined after each series of measurements. The cantilever/sample holder is constructed such that the components are material matched and thermally compensated from a common reference point. This design feature minimizes thermal drift of the instrument. The instrument can be used in a contact scanning mode where both normal and lateral deflections of the cantilever are measured. In addition, the instrument can be used in frictional force studies, force curve mapping of the surface, and contact potential measurements. We present examples of each, including a detailed account of the instrument design and calibration.

  11. Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range

    NASA Astrophysics Data System (ADS)

    Ćelik, Ümit; Karcı, Özgür; Uysallı, Yiǧit; Özer, H. Özgür; Oral, Ahmet

    2017-01-01

    We describe a novel radiation pressure based cantilever excitation method for imaging in dynamic mode atomic force microscopy (AFM) for the first time. Piezo-excitation is the most common method for cantilever excitation, however it may cause spurious resonance peaks. Therefore, the direct excitation of the cantilever plays a crucial role in AFM imaging. A fiber optic interferometer with a 1310 nm laser was used both for the excitation of the cantilever at the resonance and the deflection measurement of the cantilever in a commercial low temperature atomic force microscope/magnetic force microscope (AFM/MFM) from NanoMagnetics Instruments. The laser power was modulated at the cantilever's resonance frequency by a digital Phase Locked Loop (PLL). The laser beam is typically modulated by ˜500 μW, and ˜141.8 nmpp oscillation amplitude is obtained in moderate vacuum levels between 4 and 300 K. We have demonstrated the performance of the radiation pressure excitation in AFM/MFM by imaging atomic steps in graphite, magnetic domains in CoPt multilayers between 4 and 300 K and Abrikosov vortex lattice in BSCCO(2212) single crystal at 4 K for the first time.

  12. Design optimization of piezoresistive cantilevers for force sensing in air and water

    PubMed Central

    Doll, Joseph C.; Park, Sung-Jin; Pruitt, Beth L.

    2009-01-01

    Piezoresistive cantilevers fabricated from doped silicon or metal films are commonly used for force, topography, and chemical sensing at the micro- and macroscales. Proper design is required to optimize the achievable resolution by maximizing sensitivity while simultaneously minimizing the integrated noise over the bandwidth of interest. Existing analytical design methods are insufficient for modeling complex dopant profiles, design constraints, and nonlinear phenomena such as damping in fluid. Here we present an optimization method based on an analytical piezoresistive cantilever model. We use an existing iterative optimizer to minimimize a performance goal, such as minimum detectable force. The design tool is available as open source software. Optimal cantilever design and performance are found to strongly depend on the measurement bandwidth and the constraints applied. We discuss results for silicon piezoresistors fabricated by epitaxy and diffusion, but the method can be applied to any dopant profile or material which can be modeled in a similar fashion or extended to other microelectromechanical systems. PMID:19865512

  13. Lateral force calibration of an atomic force microscope with a diamagnetic levitation spring system

    SciTech Connect

    Li, Q.; Kim, K.-S.; Rydberg, A.

    2006-06-15

    A novel diamagnetic lateral force calibrator (D-LFC) has been developed to directly calibrate atomic force microscope (AFM) cantilever-tip or -bead assemblies. This enables an AFM to accurately measure the lateral forces encountered in friction or biomechanical-testing experiments at a small length scale. In the process of development, deformation characteristics of the AFM cantilever assemblies under frictional loading have been analyzed and four essential response variables, i.e., force constants, of the assembly have been identified. Calibration of the lateral force constant and the 'crosstalk' lateral force constant, among the four, provides the capability of measuring absolute AFM lateral forces. The D-LFC is composed of four NdFeB magnets and a diamagnetic pyrolytic graphite sheet, which can calibrate the two constants with an accuracy on the order of 0.1%. Preparation of the D-LFC and the data processing required to get the force constants is significantly simpler than any other calibration methods. The most up-to-date calibration technique, known as the 'wedge method', calibrates mainly one of the two constants and, if the crosstalk effect is properly analyzed, is primarily applicable to a sharp tip. In contrast, the D-LFC can calibrate both constants simultaneously for AFM tips or beads with any radius of curvature. These capabilities can extend the applicability of AFM lateral force measurement to studies of anisotropic multiscale friction processes and biomechanical behavior of cells and molecules under combined loading. Details of the D-LFC method as well as a comparison with the wedge method are provided in this article.

  14. An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments

    PubMed Central

    Sevim, Semih; Shamsudhin, Naveen; Ozer, Sevil; Feng, Luying; Fakhraee, Arielle; Ergeneman, Olgaç; Pané, Salvador; Nelson, Bradley J.; Torun, Hamdi

    2016-01-01

    We report a modular atomic force microscope (AFM) design for biomolecular experiments. The AFM head uses readily available components and incorporates deflection-based optics and a piezotube-based cantilever actuator. Jetted-polymers have been used in the mechanical assembly, which allows rapid manufacturing. In addition, a FeCo-tipped electromagnet provides high-force cantilever actuation with vertical magnetic fields up to 0.55 T. Magnetic field calibration has been performed with a micro-hall sensor, which corresponds well with results from finite element magnetostatics simulations. An integrated force resolution of 1.82 and 2.98 pN, in air and in DI water, respectively was achieved in 1 kHz bandwidth with commercially available cantilevers made of Silicon Nitride. The controller and user interface are implemented on modular hardware to ensure scalability. The AFM can be operated in different modes, such as molecular pulling or force-clamp, by actuating the cantilever with the available actuators. The electromagnetic and piezoelectric actuation capabilities have been demonstrated in unbinding experiments of the biotin-streptavidin complex. PMID:27273214

  15. An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments

    NASA Astrophysics Data System (ADS)

    Sevim, Semih; Shamsudhin, Naveen; Ozer, Sevil; Feng, Luying; Fakhraee, Arielle; Ergeneman, Olgaç; Pané, Salvador; Nelson, Bradley J.; Torun, Hamdi

    2016-06-01

    We report a modular atomic force microscope (AFM) design for biomolecular experiments. The AFM head uses readily available components and incorporates deflection-based optics and a piezotube-based cantilever actuator. Jetted-polymers have been used in the mechanical assembly, which allows rapid manufacturing. In addition, a FeCo-tipped electromagnet provides high-force cantilever actuation with vertical magnetic fields up to 0.55 T. Magnetic field calibration has been performed with a micro-hall sensor, which corresponds well with results from finite element magnetostatics simulations. An integrated force resolution of 1.82 and 2.98 pN, in air and in DI water, respectively was achieved in 1 kHz bandwidth with commercially available cantilevers made of Silicon Nitride. The controller and user interface are implemented on modular hardware to ensure scalability. The AFM can be operated in different modes, such as molecular pulling or force-clamp, by actuating the cantilever with the available actuators. The electromagnetic and piezoelectric actuation capabilities have been demonstrated in unbinding experiments of the biotin-streptavidin complex.

  16. An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments.

    PubMed

    Sevim, Semih; Shamsudhin, Naveen; Ozer, Sevil; Feng, Luying; Fakhraee, Arielle; Ergeneman, Olgaç; Pané, Salvador; Nelson, Bradley J; Torun, Hamdi

    2016-06-07

    We report a modular atomic force microscope (AFM) design for biomolecular experiments. The AFM head uses readily available components and incorporates deflection-based optics and a piezotube-based cantilever actuator. Jetted-polymers have been used in the mechanical assembly, which allows rapid manufacturing. In addition, a FeCo-tipped electromagnet provides high-force cantilever actuation with vertical magnetic fields up to 0.55 T. Magnetic field calibration has been performed with a micro-hall sensor, which corresponds well with results from finite element magnetostatics simulations. An integrated force resolution of 1.82 and 2.98 pN, in air and in DI water, respectively was achieved in 1 kHz bandwidth with commercially available cantilevers made of Silicon Nitride. The controller and user interface are implemented on modular hardware to ensure scalability. The AFM can be operated in different modes, such as molecular pulling or force-clamp, by actuating the cantilever with the available actuators. The electromagnetic and piezoelectric actuation capabilities have been demonstrated in unbinding experiments of the biotin-streptavidin complex.

  17. Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range.

    PubMed

    Zhou, Yusheng; Shang, Guangyi; Cai, Wei; Yao, Jun-en

    2010-05-01

    A cantilevered bimorph-based resonance-mode scanner for high speed atomic force microscope (AFM) imaging is presented. The free end of the bimorph is used for mounting a sample stage and the other one of that is fixed on the top of a conventional single tube scanner. High speed scanning is realized with the bimorph-based scanner vibrating at resonant frequency driven by a sine wave voltage applied to one piezolayer of the bimorph, while slow scanning is performed by the tube scanner. The other piezolayer provides information on vibration amplitude and phase of the bimorph itself simultaneously, which is used for real-time data processing and image calibration. By adjusting the free length of the bimorph, the line scan rate can be preset ranging from several hundred hertz to several kilohertz, which would be beneficial for the observation of samples with different properties. Combined with a home-made AFM system and a commercially available data acquisition card, AFM images of various samples have been obtained, and as an example, images of the silicon grating taken at a line rate of 1.5 kHz with the scan size of 20 microm are given. By manually moving the sample of polished Al foil surface while scanning, the capability of dynamic imaging is demonstrated.

  18. First Atomic Force Microscope Image from Mars

    NASA Technical Reports Server (NTRS)

    2008-01-01

    This calibration image presents three-dimensional data from the atomic force microscope on NASA's Phoenix Mars Lander, showing surface details of a substrate on the microscope station's sample wheel. It will be used as an aid for interpreting later images that will show shapes of minuscule Martian soil particles.

    The area imaged by the microscope is 40 microns by 40 microns, small enough to fit on an eyelash. The grooves in this substrate are 14 microns (0.00055 inch) apart, from center to center. The vertical dimension is exaggerated in the image to make surface details more visible. The grooves are 300 nanometers (0.00001 inch) deep.

    This is the first atomic force microscope image recorded on another planet. It was taken on July 9, 2008, during the 44th Martian day, or sol, of the Phoenix mission since landing.

    Phoenix's Swiss-made atomic force microscope builds an image of the surface shape of a particle by sensing it with a sharp tip at the end of a spring, all microfabricated out of a silicon wafer. A strain gauge records how far the spring flexes to follow the contour of the surface. It can provide details of soil-particle shapes smaller than one-hundredth the width of a human hair. This is about 20 times smaller than what can be resolved with Phoenix's optical microscope, which has provided much higher-magnification imaging than anything seen on Mars previously. Both microscopes are part of Phoenix's Microscopy, Electrochemistry and Conductivity Analyzer.

  19. Dynamic nuclear polarization in a magnetic resonance force microscope experiment.

    PubMed

    Issac, Corinne E; Gleave, Christine M; Nasr, Paméla T; Nguyen, Hoang L; Curley, Elizabeth A; Yoder, Jonilyn L; Moore, Eric W; Chen, Lei; Marohn, John A

    2016-04-07

    We report achieving enhanced nuclear magnetization in a magnetic resonance force microscope experiment at 0.6 tesla and 4.2 kelvin using the dynamic nuclear polarization (DNP) effect. In our experiments a microwire coplanar waveguide delivered radiowaves to excite nuclear spins and microwaves to excite electron spins in a 250 nm thick nitroxide-doped polystyrene sample. Both electron and proton spin resonance were observed as a change in the mechanical resonance frequency of a nearby cantilever having a micron-scale nickel tip. NMR signal, not observable from Curie-law magnetization at 0.6 T, became observable when microwave irradiation was applied to saturate the electron spins. The resulting NMR signal's size, buildup time, dependence on microwave power, and dependence on irradiation frequency was consistent with a transfer of magnetization from electron spins to nuclear spins. Due to the presence of an inhomogeneous magnetic field introduced by the cantilever's magnetic tip, the electron spins in the sample were saturated in a microwave-resonant slice 10's of nm thick. The spatial distribution of the nuclear polarization enhancement factor ε was mapped by varying the frequency of the applied radiowaves. The observed enhancement factor was zero for spins in the center of the resonant slice, was ε = +10 to +20 for spins proximal to the magnet, and was ε = -10 to -20 for spins distal to the magnet. We show that this bipolar nuclear magnetization profile is consistent with cross-effect DNP in a ∼10(5) T m(-1) magnetic field gradient. Potential challenges associated with generating and using DNP-enhanced nuclear magnetization in a nanometer-resolution magnetic resonance imaging experiment are elucidated and discussed.

  20. Numerical analysis of dynamic force spectroscopy using the torsional harmonic cantilever

    NASA Astrophysics Data System (ADS)

    Solares, Santiago D.; Hölscher, Hendrik

    2010-02-01

    A spectral analysis method has been recently introduced by Stark et al (2002 Proc. Natl Acad. Sci. USA 99 8473-8) and implemented by Sahin et al (2007 Nat. Nanotechnol. 2 507-14) using a T-shaped cantilever design, the torsional harmonic cantilever (THC), which is capable of performing simultaneous tapping-mode atomic force microscopy imaging and force spectroscopy. Here we report on numerical simulations of the THC system using a simple dual-mass flexural-torsional model, which is applied in combination with Fourier data processing software to illustrate the spectroscopy process for quality factors corresponding to liquid, air and vacuum environments. We also illustrate the acquisition of enhanced topographical images and deformed surface contours under the application of uniform forces, and compare the results to those obtained with a previously reported linear dual-spring-mass model.

  1. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.

    PubMed

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M

    2016-09-21

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model.

  2. V-shaped metallic-wire cantilevers for combined atomic force microscopy and Fowler-Nordheim imaging

    NASA Astrophysics Data System (ADS)

    Peterson, Charles A.; Workman, Richard K.; Yao, Xiaowei; Hunt, Jeffery P.; Sarid, Dror

    1998-12-01

    A method for fabricating V-shaped cantilevers from a flattened Pt/Ir metal wire for combined atomic force microscopy and Fowler-Nordheim imaging is described. These novel cantilevers have been found to be more robust then conventional ones used for scanning capacitance and magnetic force microscopy as their conductivity is maintained even after a large number of surface scans. The use of a V-shaped geometry improves on earlier single-beam geometries by reducing rms imaging noise. Characterization of these cantilevers and combined atomic force microscopy and Fowler-Nordheim images are reported.

  3. Uncertainty quantification in nanomechanical measurements using the atomic force microscope.

    PubMed

    Wagner, Ryan; Moon, Robert; Pratt, Jon; Shaw, Gordon; Raman, Arvind

    2011-11-11

    Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale resolution of both inorganic and biological surfaces and nanomaterials. We present a framework to ascribe uncertainty to local nanomechanical properties of any nanoparticle or surface measured with the AFM by taking into account the main uncertainty sources inherent in such measurements. We demonstrate the framework by quantifying uncertainty in AFM-based measurements of the transverse elastic modulus of cellulose nanocrystals (CNCs), an abundant, plant-derived nanomaterial whose mechanical properties are comparable to Kevlar fibers. For a single, isolated CNC the transverse elastic modulus was found to have a mean of 8.1 GPa and a 95% confidence interval of 2.7-20 GPa. A key result is that multiple replicates of force-distance curves do not sample the important sources of uncertainty, which are systematic in nature. The dominant source of uncertainty is the nondimensional photodiode sensitivity calibration rather than the cantilever stiffness or Z-piezo calibrations. The results underscore the great need for, and open a path towards, quantifying and minimizing uncertainty in AFM-based material property measurements of nanoparticles, nanostructured surfaces, thin films, polymers and biomaterials.

  4. Atomic Force Microscope for Imaging and Spectroscopy

    NASA Technical Reports Server (NTRS)

    Pike, W. T.; Hecht, M. H.; Anderson, M. S.; Akiyama, T.; Gautsch, S.; deRooij, N. F.; Staufer, U.; Niedermann, Ph.; Howald, L.; Mueller, D.

    2000-01-01

    We have developed, built, and tested an atomic force microscope (AFM) for extraterrestrial applications incorporating a micromachined tip array to allow for probe replacement. It is part of a microscopy station originally intended for NASA's 2001 Mars lander to identify the size, distribution, and shape of Martian dust and soil particles. As well as imaging topographically down to nanometer resolution, this instrument can be used to reveal chemical information and perform infrared and Raman spectroscopy at unprecedented resolution.

  5. Simulating atomic force microscope images with density functional theory: The role of nonclassical contributions to the force

    NASA Astrophysics Data System (ADS)

    Schaffhauser, Philipp; Kümmel, Stephan

    2016-07-01

    We discuss a scheme for calculating atomic force microscope images within the framework of density functional theory (DFT). As in earlier works [T. L. Chan et al., Phys. Rev. Lett. 102, 176101 (2009), 10.1103/PhysRevLett.102.176101; M. Kim and J. R. Chelikowsky, Appl. Surf. Sci. 303, 163 (2014), 10.1016/j.apsusc.2014.02.127] we do not simulate the cantilever explicitly, but consider it as a polarizable object. We go beyond previous studies by discussing the role of exchange and correlation effects; i.e., we approximately take into account the Pauli interaction between sample and cantilever. The good agreement that we find when comparing our calculated images to experimental images for the difficult case of the 8-hydroxyquinoline molecule demonstrates that exchange-correlation effects can play an important role in the DFT-based interpretation of AFM images.

  6. Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

    NASA Astrophysics Data System (ADS)

    Satoh, Nobuo; Kobayashi, Kei; Watanabe, Shunji; Fujii, Toru; Matsushige, Kazumi; Yamada, Hirofumi

    2016-08-01

    In this study, we developed an atomic force microscopy (AFM) system with scanning near-field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead zirconate titanate (PZT) thin film. Both optical and mechanical detection techniques were adopted in SNOM to detect scattered light induced by the interaction of the PZT cantilever tip apex and evanescent light, and SNOM images were obtained for each detection scheme. The mechanical detection technique did allow for a clear observation of the light scattered from the PZT cantilever without the interference observed by the optical detection technique, which used an objective lens, a pinhole, and a photomultiplier tube.

  7. Atomic force microscopy of Precambrian microscopic fossils.

    PubMed

    Kempe, André; Schopf, J William; Altermann, Wladyslaw; Kudryavtsev, Anatoliy B; Heckl, Wolfgang M

    2002-07-09

    Atomic force microscopy (AFM) is a technique used routinely in material science to image substances at a submicron (including nm) scale. We apply this technique to analysis of the fine structure of organic-walled Precambrian fossils, microscopic sphaeromorph acritarchs (cysts of planktonic unicellular protists) permineralized in approximately 650-million-year-old cherts of the Chichkan Formation of southern Kazakhstan. AFM images, backed by laser-Raman spectroscopic analysis of individual specimens, demonstrate that the walls of these petrified fossils are composed of stacked arrays of approximately 200-nm-sized angular platelets of polycyclic aromatic kerogen. Together, AFM and laser-Raman spectroscopy provide means by which to elucidate the submicron-scale structure of individual microscopic fossils, investigate the geochemical maturation of ancient organic matter, and, potentially, distinguish true fossils from pseudofossils and probe the mechanisms of fossil preservation by silica permineralization.

  8. Atomic force microscopy of Precambrian microscopic fossils

    PubMed Central

    Kempe, André; Schopf, J. William; Altermann, Wladyslaw; Kudryavtsev, Anatoliy B.; Heckl, Wolfgang M.

    2002-01-01

    Atomic force microscopy (AFM) is a technique used routinely in material science to image substances at a submicron (including nm) scale. We apply this technique to analysis of the fine structure of organic-walled Precambrian fossils, microscopic sphaeromorph acritarchs (cysts of planktonic unicellular protists) permineralized in ≈650-million-year-old cherts of the Chichkan Formation of southern Kazakhstan. AFM images, backed by laser-Raman spectroscopic analysis of individual specimens, demonstrate that the walls of these petrified fossils are composed of stacked arrays of ≈200-nm-sized angular platelets of polycyclic aromatic kerogen. Together, AFM and laser-Raman spectroscopy provide means by which to elucidate the submicron-scale structure of individual microscopic fossils, investigate the geochemical maturation of ancient organic matter, and, potentially, distinguish true fossils from pseudofossils and probe the mechanisms of fossil preservation by silica permineralization. PMID:12089337

  9. Enhanced Raman scattering for temperature measurement of a laser-heated atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    McCarthy, Brendan; Zhao, Yanming; Grover, Ranjan; Sarid, Dror

    2005-03-01

    Illuminating a silicon cantilever of an atomic force microscope with a focused laser beam creates heat that can be funneled into a nanoscale area at the apex of its tip. To characterize the heating dynamics and measure the temperature of the tip, a Raman scattering pump-and-probe method is used. It is found that at the apex of the tip the intensity of the Raman Stokes and anti-Stokes components are significantly enhanced relative to those obtained on a bulk silicon sample. Modeling the temperature rise at the tip of the cantilever by a closed-form analytical expression gives good agreement with the Raman measurements. This model can be used to design the structure of the cantilever so that the heat delivery to its tip is optimized. Such an optimized cantilever can potentially be used in high-density, heat-assisted magnetic recording, optical data storage using phase-change media and thermomechanical recording systems, for example, where nanoscale heated regions are of importance.

  10. Applied voltage dependence of nano-oxidation of ferromagnetic thin films using atomic force microscope

    NASA Astrophysics Data System (ADS)

    Takemura, Yasushi; Kidaka, Seiichi; Watanabe, Keizo; Nasu, Yasuaki; Yamada, Tsutomu; Shirakashi, Jun-ichi

    2003-05-01

    Nanodots of Ni, CoFe, and Cr oxide were fabricated by the nano-oxidation technique using atomic force microscope. The dot size was controlled from 40 to 200 nm by changing the pulse voltage applied to the cantilever from 2 to 10 V. In order to evaluate the size of the nanostructures quantitatively, the electric field emitted from the cantilever was calculated. The threshold electric field strength was defined as the minimum strength to promote the oxidation. The threshold field strength of the order of 107 V/m was derived by fitting the experimental results. The voltage dependence of the size of fabricated Cr-oxide dots was fitted well by the calculation. The dot size of the ferromagnet-based oxide was fluctuating and did not agree with the calculation. From the theoretical analysis, it was suggested that the size of the nanostructures did not depend on the distance between the cantilever and film surface, but significantly depended on the curvature radius of the cantilever.

  11. Mechanical properties of graphene cantilever from atomic force microscopy and density functional theory.

    PubMed

    Rasuli, R; Iraji Zad, A; Ahadian, M M

    2010-05-07

    We have studied the mechanical properties of a few-layer graphene cantilever (FLGC) using atomic force microscopy (AFM). The mechanical properties of the suspended FLGC over an open hole have been derived from the AFM data. Force displacement curves using the Derjaguin-Müller-Toporov (DMT) and the massless cantilever beam models yield a Young modulus of E(c) approximately 37, E(a) approximately 0.7 TPa and a Hamakar constant of approximately 3 x 10( - 18) J. The threshold force to shear the FLGC was determined from a breaking force and modeling. In addition, we studied a graphene nanoribbon (GNR), which is a system similar to the FLGC; using density functional theory (DFT). The in-plane Young's modulus for the GNRs were calculated from the DFT outcomes approximately 0.82 TPa and the results were compared with the experiment. We found that the Young's modulus and the threshold shearing force are dependent on the direction of applied force and the values are different for zigzag edge and armchair edge GNRs.

  12. High speed tapping mode atomic force microscopy in liquid using an insulated piezoelectric cantilever

    NASA Astrophysics Data System (ADS)

    Rogers, B.; Sulchek, T.; Murray, K.; York, D.; Jones, M.; Manning, L.; Malekos, S.; Beneschott, B.; Adams, J. D.; Cavazos, H.; Minne, S. C.

    2003-11-01

    Quicker imaging times for tapping mode atomic force microscopy in liquid could provide a real-time imaging tool for studying dynamic phenomena in physiological conditions. We demonstrate faster imaging speed using microcantilevers with integrated piezoelectric actuators. The exposed electric components of the cantilever necessitate an insulation scheme for use in liquid; three coating schemes have been tested. Preliminary tapping mode images have been taken using the insulated microactuator to simultaneously vibrate and actuate the cantilever over topographical features in liquid, including a high speed image of steps on a mica surface in water and an image of two e coli bacteria taken in saline solution at 75.5 μm/s, a threefold improvement in bandwidth versus conventional piezotube actuators.

  13. Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dorwling-Carter, Livie; Dermutz, Harald; Behr, Pascal; Vörös, János; Zambelli, Tomaso

    2015-12-01

    We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath. We could thus simultaneously measure the ionic current and the cantilever bending (in optical beam deflection mode). First, we quantitatively compared the SICM and AFM contact points on the approach curves. Second, we estimated where the probe in SICM mode touches the sample during scanning on a calibration grid and applied the finding to image a network of neurites on a Petri dish. Finally, we assessed the feasibility of a double controller using both the ionic current and the deflection as input signals of the piezofeedback. The experimental data were rationalized in the framework of finite elements simulations.

  14. Sharp Tips on the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

    The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007.

    The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London.

    The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  15. Fast on-wafer electrical, mechanical, and electromechanical characterization of piezoresistive cantilever force sensors.

    PubMed

    Tosolini, G; Villanueva, L G; Perez-Murano, F; Bausells, J

    2012-01-01

    Validation of a technological process requires an intensive characterization of the performance of the resulting devices, circuits, or systems. The technology for the fabrication of micro and nanoelectromechanical systems (MEMS and NEMS) is evolving rapidly, with new kind of device concepts for applications like sensing or harvesting are being proposed and demonstrated. However, the characterization tools and methods for these new devices are still not fully developed. Here, we present an on-wafer, highly precise, and rapid characterization method to measure the mechanical, electrical, and electromechanical properties of piezoresistive cantilevers. The setup is based on a combination of probe-card and atomic force microscopy technology, it allows accessing many devices across a wafer and it can be applied to a broad range of MEMS and NEMS. Using this setup we have characterized the performance of multiple submicron thick piezoresistive cantilever force sensors. For the best design we have obtained a force sensitivity Re(F) = 158μV/nN, a noise of 5.8 μV (1 Hz-1 kHz) and a minimum detectable force of 37 pN with a relative standard deviation of σ(r) ≈ 8%. This small value of σ(r), together with a high fabrication yield >95%, validates our fabrication technology. These devices are intended to be used as bio-molecular detectors for the measurement of intermolecular forces between ligand and receptor molecule pairs.

  16. Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

    SciTech Connect

    Torun, H.; Torello, D.; Degertekin, F. L.

    2011-08-15

    The authors describe a method of actuation for atomic force microscope (AFM) probes to improve imaging speed and displacement range simultaneously. Unlike conventional piezoelectric tube actuation, the proposed method involves a lever and fulcrum ''seesaw'' like actuation mechanism that uses a small, fast piezoelectric transducer. The lever arm of the seesaw mechanism increases the apparent displacement range by an adjustable gain factor, overcoming the standard tradeoff between imaging speed and displacement range. Experimental characterization of a cantilever holder implementing the method is provided together with comparative line scans obtained with contact mode imaging. An imaging bandwidth of 30 kHz in air with the current setup was demonstrated.

  17. Uncertainty quantification in nanomechanical measurements using the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wagner, Ryan; Moon, Robert; Pratt, Jon; Shaw, Gordon; Raman, Arvind

    2011-11-01

    Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale resolution of both inorganic and biological surfaces and nanomaterials. We present a framework to ascribe uncertainty to local nanomechanical properties of any nanoparticle or surface measured with the AFM by taking into account the main uncertainty sources inherent in such measurements. We demonstrate the framework by quantifying uncertainty in AFM-based measurements of the transverse elastic modulus of cellulose nanocrystals (CNCs), an abundant, plant-derived nanomaterial whose mechanical properties are comparable to Kevlar fibers. For a single, isolated CNC the transverse elastic modulus was found to have a mean of 8.1 GPa and a 95% confidence interval of 2.7-20 GPa. A key result is that multiple replicates of force-distance curves do not sample the important sources of uncertainty, which are systematic in nature. The dominant source of uncertainty is the nondimensional photodiode sensitivity calibration rather than the cantilever stiffness or Z-piezo calibrations. The results underscore the great need for, and open a path towards, quantifying and minimizing uncertainty in AFM-based material property measurements of nanoparticles, nanostructured surfaces, thin films, polymers and biomaterials. This work is a partial contribution of the USDA Forest Service and NIST, agencies of the US government, and is not subject to copyright.

  18. Nanostethoscopy: A new mode of operation of the atomic force microscope

    SciTech Connect

    Keaton, A.; Holzrichter, J.F.; Balhorn, R.; Siekaus, W.J.

    1994-02-01

    The authors introduce a new mode of operation of the atomic force microscope (AFM). This detection scheme, a {open_quotes}Nano-Stethoscope{close_quotes}. Involves using the atomic force microscope in a novel acoustic mode not generally recognized. The Nano-Stethoscope uses the conventional scanning feature to locate a desired site, positions the AFM microscope tip over the site, holds the cantilever stationary (in x and v) and records the tip`s z-motion as a function of time. The tip/cantilever system thus functions as a micro-motion detector to respond to characteristic {open_quotes}pulsations{close_quotes}, nano-configurational chances, or any other event that influences the position of the tip as a function of time. The authors have demonstrated the feasibility of using the tip of an AFM in this manner in a biological system with a measurement of the vibrations of an emerging shrimp egg nauplius ({approximately}3 {mu}m. -10 Hz) and on the Angstrom scale in a non-biological system i.e.. the thermal expansion of metal interconnect lines on a microelectronic circuit.

  19. Dynamically forced cantilever system: A piezo-polymer characterization tool with possible application for micromechanical HF resonator devices

    SciTech Connect

    Schwoediauer, Reinhard

    2005-04-01

    A cantilever system, driven to a dynamically forced oscillation by a small piezoelectric specimen is presented as a simple and accurate tool to determine the converse dynamic piezocoefficient up to several kHz. The piezoelectric sample is mounted on top of a reflective cantilever where it is free to oscillate without any mechanical constraint. A Nomarsky-interferometer detects the induced cantilever displacement. The presented technique is especially suited for a precise characterization of small and soft piezoelectric polymer-samples with rough surfaces. The capability of the dynamically forced cantilever principle is demonstrated with a LiNbO{sub 3} crystal and with a porous ferroelectretic polypropylene foam. Results from measurements between 400 Hz and 5 kHz were found to be in excellent agreement with published values. Additionally, the dynamically forced cantilever principle may possibly improve the sensitivity of some micromechanical cantilever-sensors and it could also be interesting for the design of enhanced micromechanical high frequency mixer filters. Some ideas about are briefly presented.

  20. Endonuclease-based logic gates and sensors using magnetic force-amplified readout of DNA scission on cantilevers.

    PubMed

    Weizmann, Yossi; Elnathan, Roey; Lioubashevski, Oleg; Willner, Itamar

    2005-09-14

    The endonuclease scission of magnetic particles functionalized with sequence-specific DNAs, which are associated on cantilevers, is followed by the magnetic force-amplified readout of the reactions by the nano-mechanical deflection/retraction of the cantilevers. The systems are employed to develop AND or OR logic gates and to detect single base mismatch specificity of the endonucleases. The two endonucleases EcoRI (E(A)) and AscI (E(B)) are used as inputs. The removal of magnetic particles linked to the cantilever by the duplexes 1/1a and 2/2a via the simultaneous cleavage of the DNAs by E(A) and E(B) leads to the retraction of the magnetically deflected cantilever and to the establishment of the "AND" gate. The removal of the magnetic particles linked to the cantilevers by the duplex 3/3a by either E(A) or E(B) leads to the retraction of the magnetically deflected cantilever and to the establishment of the "OR" gate. The magnetic force-amplified readout of endonuclease activities is also employed to reveal single base mismatch specificity of the biocatalysts.

  1. Measurement of interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} and immobilized vitronectin on the cantilever tip

    SciTech Connect

    Lee, Minsu; Yang, Hyun-Kyu; Park, Keun-Hyung; Kang, Dong-Ku; Chang, Soo-Ik Kang, In-Cheol

    2007-11-03

    Protein nanoarrays containing integrin {alpha}{sub v}{beta}{sub 3} or BSA were fabricated on ProLinker{sup TM}-coated Au surface by dip-pen nanolithography (DPN). An atomic force microscope (AFM) tip coated with ProLinker{sup TM} was modified by vitronectin. We measured the interaction force between nanoarrayed integrin {alpha}{sub v}{beta}{sub 3} or BSA and immobilized vitronectin on the cantilever tip by employing tethering-unbinding method. The unbinding force between integrin {alpha}{sub v}{beta}{sub 3} and vitronectin (1087 {+-} 62 pN) was much higher than that of between BSA and vitronectin (643 {+-} 74 pN). These results demonstrate that one can distinguish a specific protein interaction from non-specific interactions by means of force measurement on the molecular interactions between the nanoarrayed protein and its interacting protein on the AFM tip.

  2. Increased imaging speed and force sensitivity for bio-applications with small cantilevers using a conventional AFM setup

    PubMed Central

    Leitner, Michael; Fantner, Georg E.; Fantner, Ernest J.; Ivanova, Katerina; Ivanov, Tzvetan; Rangelow, Ivo; Ebner, Andreas; Rangl, Martina; Tang, Jilin; Hinterdorfer, Peter

    2012-01-01

    In this study, we demonstrate the increased performance in speed and sensitivity achieved by the use of small AFM cantilevers on a standard AFM system. For this, small rectangular silicon oxynitride cantilevers were utilized to arrive at faster atomic force microscopy (AFM) imaging times and more sensitive molecular recognition force spectroscopy (MRFS) experiments. The cantilevers we used had lengths between 13 and 46 μm, a width of about 11 μm, and a thickness between 150 and 600 nm. They were coated with chromium and gold on the backside for a better laser reflection. We characterized these small cantilevers through their frequency spectrum and with electron microscopy. Due to their small size and high resonance frequency we were able to increase the imaging speed by a factor of 10 without any loss in resolution for images from several μm scansize down to the nanometer scale. This was shown on bacterial surface layers (s-layer) with tapping mode under aqueous, near physiological conditions and on nuclear membranes in contact mode in ambient environment. In addition, we showed that single molecular forces can be measured with an up to 5 times higher force sensitivity in comparison to conventional cantilevers with similar spring constants. PMID:22721963

  3. Model based control of dynamic atomic force microscope

    NASA Astrophysics Data System (ADS)

    Lee, Chibum; Salapaka, Srinivasa M.

    2015-04-01

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H∞ control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  4. Model based control of dynamic atomic force microscope.

    PubMed

    Lee, Chibum; Salapaka, Srinivasa M

    2015-04-01

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H(∞) control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  5. Model based control of dynamic atomic force microscope

    SciTech Connect

    Lee, Chibum; Salapaka, Srinivasa M.

    2015-04-15

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H{sub ∞} control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  6. Minimizing pulling geometry errors in atomic force microscope single molecule force spectroscopy.

    PubMed

    Rivera, Monica; Lee, Whasil; Ke, Changhong; Marszalek, Piotr E; Cole, Daniel G; Clark, Robert L

    2008-10-01

    In atomic force microscopy-based single molecule force spectroscopy (AFM-SMFS), it is assumed that the pulling angle is negligible and that the force applied to the molecule is equivalent to the force measured by the instrument. Recent studies, however, have indicated that the pulling geometry errors can drastically alter the measured force-extension relationship of molecules. Here we describe a software-based alignment method that repositions the cantilever such that it is located directly above the molecule's substrate attachment site. By aligning the applied force with the measurement axis, the molecule is no longer undergoing combined loading, and the full force can be measured by the cantilever. Simulations and experimental results verify the ability of the alignment program to minimize pulling geometry errors in AFM-SMFS studies.

  7. Minimizing Pulling Geometry Errors in Atomic Force Microscope Single Molecule Force Spectroscopy

    PubMed Central

    Rivera, Monica; Lee, Whasil; Ke, Changhong; Marszalek, Piotr E.; Cole, Daniel G.; Clark, Robert L.

    2008-01-01

    In atomic force microscopy-based single molecule force spectroscopy (AFM-SMFS), it is assumed that the pulling angle is negligible and that the force applied to the molecule is equivalent to the force measured by the instrument. Recent studies, however, have indicated that the pulling geometry errors can drastically alter the measured force-extension relationship of molecules. Here we describe a software-based alignment method that repositions the cantilever such that it is located directly above the molecule's substrate attachment site. By aligning the applied force with the measurement axis, the molecule is no longer undergoing combined loading, and the full force can be measured by the cantilever. Simulations and experimental results verify the ability of the alignment program to minimize pulling geometry errors in AFM-SMFS studies. PMID:18641069

  8. Optimum Design of Cantilevered Microprobes for Inspecting Lcd Panels and Measurement of Contacting Forces

    NASA Astrophysics Data System (ADS)

    Kim, Cheol; Kim, Kwang-Joong

    Fine pitch microprobe arrays are microneedle-like probes for inspecting the pixels of LCD panels or IC. They are usually made of multi-layers of metallic, nonmetallic, or combination of the two. The design requirement for a contacting force is less than 2 gf and a deflection should be less than 100 µm. Many microprobe shapes satisfying the design requirements are possible. A cantilever-type microprobe having many needles was chosen and optimized in this study. Several candidate shapes were chosen using topology and shape optimization technique subjected to design requirements. Then, the microprobe arrays were fabricated using the process applied for MEMS fabrication and they were made of BeNi, BeCu, or Si. The contact probing forces and deflections were measured for checking the results from optimum design by newly developed measuring equipment in our laboratory. Numerical and experimental results were compared and both showed a good correlation.

  9. Nanomechanical assessment of human and murine collagen fibrils via atomic force microscopy cantilever-based nanoindentation.

    PubMed

    Andriotis, Orestis G; Manuyakorn, Wiparat; Zekonyte, Jurgita; Katsamenis, Orestis L; Fabri, Sebastien; Howarth, Peter H; Davies, Donna E; Thurner, Philipp J

    2014-11-01

    The nanomechanical assessment of collagen fibrils via atomic force microscopy (AFM) is of increasing interest within the biomedical research community. In contrast to conventional nanoindentation there exists no common standard for conducting experiments and analysis of data. Currently used analysis approaches vary between studies and validation of quantitative results is usually not performed, which makes comparison of data from different studies difficult. Also there are no recommendations with regards to the maximum indentation depth that should not be exceeded to avoid substrate effects. Here we present a methodology and analysis approach for AFM cantilever-based nanoindentation experiments that allows efficient use of captured data and relying on a reference sample for determination of tip shape. Further we show experimental evidence that maximum indentation depth on collagen fibrils should be lower than 10-15% of the height of the fibril to avoid substrate effects and we show comparisons between our and other approaches used in previous works. While our analysis approach yields similar values for indentation modulus compared to the Oliver-Pharr method we found that Hertzian analysis yielded significantly lower values. Applying our approach we successfully and efficiently indented collagen fibrils from human bronchi, which were about 30 nm in size, considerably smaller compared to collagen fibrils obtained from murine tail-tendon. In addition, derived mechanical parameters of collagen fibrils are in agreement with data previously published. To establish a quantitative validation we compared indentation results from conventional and AFM cantilever-based nanoindentation on polymeric samples with known mechanical properties. Importantly we can show that our approach yields similar results when compared to conventional nanoindentation on polymer samples. Introducing an approach that is reliable, efficient and taking into account the AFM tip shape, we anticipate

  10. Cantilever tilt causing amplitude related convolution in dynamic mode atomic force microscopy.

    PubMed

    Wang, Chunmei; Sun, Jielin; Itoh, Hiroshi; Shen, Dianhong; Hu, Jun

    2011-01-01

    It is well known that the topography in atomic force microscopy (AFM) is a convolution of the tip's shape and the sample's geometry. The classical convolution model was established in contact mode assuming a static probe, but it is no longer valid in dynamic mode AFM. It is still not well understood whether or how the vibration of the probe in dynamic mode affects the convolution. Such ignorance complicates the interpretation of the topography. Here we propose a convolution model for dynamic mode by taking into account the typical design of the cantilever tilt in AFMs, which leads to a different convolution from that in contact mode. Our model indicates that the cantilever tilt results in a dynamic convolution affected by the absolute value of the amplitude, especially in the case that corresponding contact convolution has sharp edges beyond certain angle. The effect was experimentally demonstrated by a perpendicular SiO(2)/Si super-lattice structure. Our model is useful for quantitative characterizations in dynamic mode, especially in probe characterization and critical dimension measurements.

  11. Optimizing 1-μs-Resolution Single-Molecule Force Spectroscopy on a Commercial Atomic Force Microscope.

    PubMed

    Edwards, Devin T; Faulk, Jaevyn K; Sanders, Aric W; Bull, Matthew S; Walder, Robert; LeBlanc, Marc-Andre; Sousa, Marcelo C; Perkins, Thomas T

    2015-10-14

    Atomic force microscopy (AFM)-based single-molecule force spectroscopy (SMFS) is widely used to mechanically measure the folding and unfolding of proteins. However, the temporal resolution of a standard commercial cantilever is 50-1000 μs, masking rapid transitions and short-lived intermediates. Recently, SMFS with 0.7-μs temporal resolution was achieved using an ultrashort (L = 9 μm) cantilever on a custom-built, high-speed AFM. By micromachining such cantilevers with a focused ion beam, we optimized them for SMFS rather than tapping-mode imaging. To enhance usability and throughput, we detected the modified cantilevers on a commercial AFM retrofitted with a detection laser system featuring a 3-μm circular spot size. Moreover, individual cantilevers were reused over multiple days. The improved capabilities of the modified cantilevers for SMFS were showcased by unfolding a polyprotein, a popular biophysical assay. Specifically, these cantilevers maintained a 1-μs response time while eliminating cantilever ringing (Q ≅ 0.5). We therefore expect such cantilevers, along with the instrumentational improvements to detect them on a commercial AFM, to accelerate high-precision AFM-based SMFS studies.

  12. Understanding interferometry for micro-cantilever displacement detection

    PubMed Central

    Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Summary Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry–Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber–cantilever configurations. In the Fabry–Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz0.5 under optimum conditions. PMID:27547601

  13. Understanding interferometry for micro-cantilever displacement detection.

    PubMed

    von Schmidsfeld, Alexander; Nörenberg, Tobias; Temmen, Matthias; Reichling, Michael

    2016-01-01

    Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry-Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end delivering and collecting light and a highly reflective micro-cantilever, both together forming the interferometric cavity. For a precise measurement of the cantilever displacement, the relative positioning of fiber and cantilever is of critical importance. We describe a systematic approach for accurate alignment as well as the implications of deficient fiber-cantilever configurations. In the Fabry-Pérot regime, the displacement noise spectral density strongly decreases with decreasing distance between the fiber-end and the cantilever, yielding a noise floor of 24 fm/Hz(0.5) under optimum conditions.

  14. Mechanical property investigation of soft materials by cantilever-based optical interfacial force microscopy.

    PubMed

    Kim, Byung I; Boehm, Ryan D

    2013-01-01

    Cantilever-based optical interfacial force microscopy (COIFM) was applied to the investigation of the mechanical properties of soft materials to avoid the double-spring effect and snap-to-contact problem associated with atomic force microscopy (AFM). When a force was measured as a function of distance between an oxidized silicon probe and the surface of a soft hydrocarbon film, it increases nonlinearly in the lower force region below ∼10 nN, following the Herzian model with the elastic modulus of ∼50 MPa. Above ∼10 nN, it increases linearly with a small oscillatory sawtooth pattern with amplitude 1-2 nN. The pattern suggests the possible existence of the layered structure within the film. When its internal part of the film was exposed to the probe, the force depends on the distance linearly with an adhesive force of -20 nN. This linear dependence suggests that the adhesive internal material behaved like a linear spring with a spring constant of ∼1 N/m. Constant-force images taken in the repulsive and attractive contact regimes revealed additional features that were not observed in the images taken in the noncontact regime. At some locations, however, contrast inversions were observed between the two contact regimes while the average roughness remained constant. The result suggests that some embedded materials had spring constants different from those of the surrounding material. This study demonstrated that the COIFM is capable of imaging mechanical properties of local structures such as small impurities and domains at the nanometer scale, which is a formidable challenge with conventional AFM methods.

  15. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method

    SciTech Connect

    Liu Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-15

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  16. Fiber-top and ferrule-top cantilevers for atomic force microscopy and scanning near field optical microscopy

    NASA Astrophysics Data System (ADS)

    Chavan, Dhwajal; Gruca, Grzegorz; van de Watering, Tomek; Heeck, Kier; Rector, Jan; Slaman, Martin; Andres, Dieter; Tiribilli, Bruno; Margheri, Giancarlo; Iannuzzi, Davide

    2012-04-01

    Fiber-top and ferrule-top cantilevers (FTC) are a new generation of all optical, monolithic, self-aligned microdevices. They are obtained by carving a cantilever on the cleaved end of an optical fiber (fiber-top) or on a ferrule terminated fiber (ferrule-top). FTCs rely on Fabry-Perot interferometry to measure the deflection of the cantilever with subnanometer deflection sensitivity. FTCs specially developed for scanning probe microscopy are equipped with a sharp tip that has the dual function of probing the topography and collecting/emitting light. We perform the scanning probe microscopy using these probes in air, liquid and at low temperature (12°K). The light emission/collection functionality of FTC probes also allows one to combine scanning near field optical microscopy (SNOM) and optical transmission microscopy with contact and non-contact mode atomic force microscopy (AFM). This makes FTCs ideal for AFM+SNOM on soft samples, polymers and biological specimen, where bent fiber probes and tuning fork based systems would not be recommended because of the high stiffness of those probes. We demonstrate here the capability of fiber-top cantilevers to measure deflection and collect near field optical signal, and also the capability of ferrule-top cantilevers for simultaneous optical transmission microscopy and topography of SNOM gratings. Thanks to their unique features, FTCs also open up possibilities for UV nanolithography and on-demand optical excitation at nanoscale.

  17. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method.

    PubMed

    Liu, Zhen; Jeong, Younkoo; Menq, Chia-Hsiang

    2013-02-01

    An accurate experimental method is proposed for on-spot calibration of the measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy. One of the key techniques devised for this method is a reliable contact detection mechanism that detects the tip-surface contact instantly. At the contact instant, the oscillation amplitude of the tip deflection, converted to that of the deflection signal in laser reading through the measurement sensitivity, exactly equals to the distance between the sample surface and the cantilever base position. Therefore, the proposed method utilizes the recorded oscillation amplitude of the deflection signal and the base position of the cantilever at the contact instant for the measurement sensitivity calibration. Experimental apparatus along with various signal processing and control modules was realized to enable automatic and rapid acquisition of multiple sets of data, with which the calibration of a single dynamic mode could be completed in less than 1 s to suppress the effect of thermal drift and measurement noise. Calibration of the measurement sensitivities of the first and second dynamic modes of three micro-cantilevers having distinct geometries was successfully demonstrated. The dependence of the measurement sensitivity on laser spot location was also experimentally investigated. Finally, an experiment was performed to validate the calibrated measurement sensitivity of the second dynamic mode of a micro-cantilever.

  18. Tip Effect of the Tapping Mode of Atomic Force Microscope in Viscous Fluid Environments.

    PubMed

    Shih, Hua-Ju; Shih, Po-Jen

    2015-07-28

    Atomic force microscope with applicable types of operation in a liquid environment is widely used to scan the contours of biological specimens. The contact mode of operation allows a tip to touch a specimen directly but sometimes it damages the specimen; thus, a tapping mode of operation may replace the contact mode. The tapping mode triggers the cantilever of the microscope approximately at resonance frequencies, and so the tip periodically knocks the specimen. It is well known that the cantilever induces extra liquid pressure that leads to drift in the resonance frequency. Studies have noted that the heights of protein surfaces measured via the tapping mode of an atomic force microscope are ~25% smaller than those measured by other methods. This discrepancy may be attributable to the induced superficial hydrodynamic pressure, which is worth investigating. In this paper, we introduce a semi-analytical method to analyze the pressure distribution of various tip geometries. According to our analysis, the maximum hydrodynamic pressure on the specimen caused by a cone-shaped tip is ~0.5 Pa, which can, for example, pre-deform a cell by several nanometers in compression before the tip taps it. Moreover, the pressure calculated on the surface of the specimen is 20 times larger than the pressure without considering the tip effect; these results have not been motioned in other papers. Dominating factors, such as surface heights of protein surface, mechanical stiffness of protein increasing with loading velocity, and radius of tip affecting the local pressure of specimen, are also addressed in this study.

  19. 3D simulation of AFM non-uniform piezoelectric micro-cantilever with various geometries subjected to the tip-sample forces

    NASA Astrophysics Data System (ADS)

    Korayem, Alireza Habibnejad; Abdi, Moein

    2017-03-01

    Atomic force microscope (AFM) is a powerful instrument for investigation of surface topography at different workspaces. It is important to understand the dynamic behavior of AFM to improve its performance. 3D numerical method is suitable in order to simulate experimental conditions. This paper has investigated modeling and dynamic simulation of rectangular, Dagger and V-shaped geometries of AFM piezoelectric micro-cantilever (MC) with two electrode layers in the air environment. For a better understanding of the system dynamic, multi-layer MC dynamic equation has been derived. Euler-Bernoulli beam theory has been used for modeling the AFM cantilever. Hamilton's principle has been used for the MC modeling and the finite element method (FEM) has been applied for its discretization. In 3D, with respect to the tip-sample forces piezoelectric MC has been simulated via the COMSOL software. The frequency and time responses have been also investigated. The topographies have been performed on different surfaces with various roughness's types in the tapping and non-contact mode. The results of these two methods have been compared with experimental results. Moreover, the effects of MC geometrical parameters on surfaces topography and frequency responses have been studied and optimal dimensions of topographies have been obtained for each of the beam geometries. Simulations of various tip geometries have been performed in order to examine the effects of tip dimensions on the frequency and time responses. Furthermore, the effect of tip displacement on the frequency response has been investigated for different MC lengths.

  20. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI

    NASA Astrophysics Data System (ADS)

    Cumpson, Peter J.; Hedley, John

    2003-12-01

    Calibration of atomic force microscope (AFM) cantilevers is necessary for the measurement of nanonewton and piconewton forces, which are critical to analytical applications of AFM in the analysis of polymer surfaces, biological structures and organic molecules at nanoscale lateral resolution. We have developed a compact and easy-to-use reference artefact for this calibration, using a method that allows traceability to the SI (Système International). Traceability is crucial to ensure that force measurements by AFM are comparable to those made by optical tweezers and other methods. The new non-contact calibration method measures the spring constant of these artefacts, by a combination of electrical measurements and Doppler velocimetry. The device was fabricated by silicon surface micromachining. The device allows AFM cantilevers to be calibrated quite easily by the 'cantilever-on-reference' method, with our reference device having a spring constant uncertainty of around ± 5% at one standard deviation. A simple substitution of the analogue velocimeter used in this work with a digital model should reduce this uncertainty to around ± 2%. Both are significant improvements on current practice, and allow traceability to the SI for the first time at these nanonewton levels.

  1. Nanoscale imaging of the growth and division of bacterial cells on planar substrates with the atomic force microscope.

    PubMed

    Van Der Hofstadt, M; Hüttener, M; Juárez, A; Gomila, G

    2015-07-01

    With the use of the atomic force microscope (AFM), the Nanomicrobiology field has advanced drastically. Due to the complexity of imaging living bacterial processes in their natural growing environments, improvements have come to a standstill. Here we show the in situ nanoscale imaging of the growth and division of single bacterial cells on planar substrates with the atomic force microscope. To achieve this, we minimized the lateral shear forces responsible for the detachment of weakly adsorbed bacteria on planar substrates with the use of the so called dynamic jumping mode with very soft cantilever probes. With this approach, gentle imaging conditions can be maintained for long periods of time, enabling the continuous imaging of the bacterial cell growth and division, even on planar substrates. Present results offer the possibility to observe living processes of untrapped bacteria weakly attached to planar substrates.

  2. Real time drift measurement for colloidal probe atomic force microscope: a visual sensing approach

    SciTech Connect

    Wang, Yuliang Bi, Shusheng; Wang, Huimin

    2014-05-15

    Drift has long been an issue in atomic force microscope (AFM) systems and limits their ability to make long time period measurements. In this study, a new method is proposed to directly measure and compensate for the drift between AFM cantilevers and sample surfaces in AFM systems. This was achieved by simultaneously measuring z positions for beads at the end of an AFM colloidal probe and on sample surface through an off-focus image processing based visual sensing method. The working principle and system configuration are presented. Experiments were conducted to validate the real time drift measurement and compensation. The implication of the proposed method for regular AFM measurements is discussed. We believe that this technique provides a practical and efficient approach for AFM experiments requiring long time period measurement.

  3. Construction of a 3He magnetic force microscope with a vector magnet

    NASA Astrophysics Data System (ADS)

    Yang, Jinho; Yang, Ilkyu; Kim, Yun Won; Shin, Dongwoo; Jeong, Juyoung; Wulferding, Dirk; Yeom, Han Woong; Kim, Jeehoon

    2016-02-01

    We constructed a 3He magnetic force microscope operating at the base temperature of 300 mK under a vector magnetic field of 2-2-9 T in the x-y-z direction. Fiber optic interferometry as a detection scheme is employed in which two home-built fiber walkers are used for the alignment between the cantilever and the optical fiber. The noise level of the laser interferometer is close to its thermodynamic limit. The capabilities of the sub-Kelvin and vector field are demonstrated by imaging the coexistence of magnetism and superconductivity in a ferromagnetic superconductor (ErNi2B2C) at T = 500 mK and by probing a dipole shape of a single Abrikosov vortex with an in-plane tip magnetization.

  4. Atomic force microscope based near-field imaging for probing cell surface interactions

    NASA Astrophysics Data System (ADS)

    Amini, Sina

    Near-membrane and trans-membrane proteins and their interactions with the extracellular matrix (ECM) can yield valuable information about cell dynamics. However, advances in the field of nanoscale cellular processes have been hindered, in part, due to limits imposed by current technology. In this work, a novel evanescent field (EF) imaging technique is designed, modeled, created and tested for near-field imaging in the apical surface of cells. This technique and Forster resonance energy transfer (FRET) were used to investigate interactions between integrins on the cell surface and the ECM protein, fibronectin. The goal was to monitor changes in the integrin density at the cell surface as a function of clustering after binding to fibronectin on the microsphere surface. For the EF technique, quantum dot (QD)-embedded polystyrene microspheres were used to couple light into whispering gallery modes (WGMs) inside the microspheres; the resulting EF at the surface of the microsphere was used as a near-field excitation source with ~50 nm axial resolution for exciting fluorescently-labeled integrins. For FRET measurements (~10 nm axial resolution), QDs (donors) were coated on the surface of microspheres and energy transfer to red fluorescent protein (RFP)-integrin constructs (acceptors) studied. In both techniques, the QD-modified microspheres were mounted on atomic force microscope (AFM) cantilevers, functionalized with fibronectin, and brought into contact with fluorescently-labeled HeLa or vascular smooth muscle (VSM) cells. The results obtained from both methods show the clustering and activity of the integrins and are in good agreement with each other. Amsterdam discrete dipole approximation (ADDA) was used to study the effects of inhomogeneous surrounding refractive index on the quality factor and position of the WGMs due to the attachment of a microsphere to an AFM cantilever. WGMs of various QD-embedded microspheres mounted on AFM cantilevers were experimentally

  5. Stabilized atomic force microscopy imaging in liquids using second harmonic of cantilever motion for setpoint control

    NASA Astrophysics Data System (ADS)

    Schiener, Jens; Witt, Susanne; Stark, Martin; Guckenberger, Reinhard

    2004-08-01

    We present an automated stabilization of the imaging process in tapping mode atomic force microscopy. For biological applications, the requirement of stable imaging conditions to achieve reliable high resolution is contradicted by the necessity to work in solution to ensure biological functionality: thermal and saline variations of the viscosity, in particular when exchanging the solution the sample is surrounded with, strongly affect the cantilever motion rendering the imaging process instable. Using anharmonic contributions in the deflection signal, the amplitude setpoint is controlled to compensate for unavoidable drift in the free oscillation. By this additional feedback, the tip-sample interaction is maintained stable at a low value, making the instrument robust against drift and tolerant to environmental changes. As a delicate test sample, the "single ring"-mutant of the bacterial chaperonin GroEL from E. coli was imaged. To prove the efficiency of our setup, we show highly stabilized, continuous imaging with minimized user interaction while strong perturbations by exchange of the buffer solution were imposed during the scanning.

  6. Photothermal excitation setup for a modified commercial atomic force microscope

    SciTech Connect

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kühnle, Angelika; Kobayashi, Kei; Yamada, Hirofumi

    2014-02-15

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/√(Hz) measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  7. Measurement of deep groove structures using a self-fabricated long tip in a large range metrological atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wang, S. H.; Tan, S. L.; Xu, G.; Koyama, K.

    2011-09-01

    Metrological atomic force microscopes are widely used in national metrology institutes for measuring step height, lateral pitch and surface roughness. However, the maximum measurable depth or height variation is limited by both the vertical scanning range of the AFM and the tip height and sharpness of the tip at the end of the cantilever. A normal commercial AFM typically has a vertical scanning range less than 10 µm and a tip height of the cantilever only up to 15 µm so that it can be used to detect only relatively smooth surfaces or shallow structures up to several micrometres. To overcome these limitations, we have successfully integrated a long diamond tip of up to 120 µm developed at Namiki Precision Jewel Co., Ltd of Japan onto our large range metrological atomic force microprobe (LRM-AFM) for deep groove structure measurement. The LRM-AFM is based on a nano-measuring machine with a large scanning range of 25 mm in the X and Y axes and 5 mm in the Z axis. This paper describes the long diamond tip fabrication process and especially its application in the LRM-AFM for measuring deep groove structures of a step height of up to 100 µm. In addition, the mechanical quality factor (Q) of the diamond tip micro-cantilever was detected in the system. The results demonstrate that the system is capable of calibrating and measuring the surface structure with deep groove in tens of micrometres.

  8. Improved atomic force microscope using a laser diode interferometer

    NASA Astrophysics Data System (ADS)

    Sarid, Dror; Pax, Paul; Yi, Leon; Howells, Sam; Gallagher, Mark; Chen, Ting; Elings, Virgil; Bocek, Dan

    1992-08-01

    The performance of an atomic force microscope using a laser diode interferometer has been improved to the point where its resolution is comparable to that of laser beam deflection systems. We describe the structure of this microscope, present a model that takes into account the main parameters associated with its operation, and demonstrate its sensitivity by showing images of a small area scan with atomic resolution as well as a large area scan in a stand-alone configuration.

  9. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.

    PubMed

    Naitoh, Yoshitaka; Kinoshita, Yukinori; Jun Li, Yan; Kageshima, Masami; Sugawara, Yasuhiro

    2009-07-01

    A sharp probe tip with atomic scale stability is essential and desirable for noncontact atomic force microscopy (NC-AFM) studies at the atomic scale. We observed a Ge(001) surface using both a Si cantilever and a tungsten coated Si cantilever at room temperature in order to investigate the influence of the tip apex structure on the NC-AFM images. By using the Si cantilever, we first obtained four types of image at the atomic scale which can be explained assuming a dimer structure on the tip apex. On the other hand, the home-made tungsten coated tip, which has atomic scale stability and high electric conductivity, imaged the so-called ordered c(4 x 2) structure without any artifacts. The tungsten coated cantilever was found to have significantly higher performance for NC-AFM studies at the atomic scale than the Si cantilever.

  10. Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

    PubMed Central

    Ruppert, Michael G; Yong, Yuen Kuan

    2017-01-01

    Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous characteristics compared to the optical beam deflection method. The possibility of down scaling, parallelization of cantilever arrays and the absence of optical interference associated imaging artifacts have led to an increased research interest in these methods. However, for multifrequency AFM, the optimization of the transducer layout on the cantilever for higher order modes has not been addressed. To fully utilize an integrated piezoelectric transducer, this work alters the layout of the piezoelectric layer to maximize both the deflection of the cantilever and measured piezoelectric charge response for a given mode with respect to the spatial distribution of the strain. On a prototype cantilever design, significant increases in actuator and sensor sensitivities were achieved for the first four modes without any substantial increase in sensor noise. The transduction mechanism is specifically targeted at multifrequency AFM and has the potential to provide higher resolution imaging on higher order modes. PMID:28326225

  11. Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

    SciTech Connect

    Borysov, Stanislav S.; Forchheimer, Daniel; Haviland, David B.

    2014-10-29

    Here we present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

  12. Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip-surface interactions.

    PubMed

    Borysov, Stanislav S; Forchheimer, Daniel; Haviland, David B

    2014-01-01

    We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip-surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

  13. Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

    PubMed Central

    Forchheimer, Daniel; Haviland, David B

    2014-01-01

    Summary We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode. PMID:25383301

  14. Development of the magnetic force-induced dual vibration energy harvester using a unimorph cantilever

    NASA Astrophysics Data System (ADS)

    Umaba, M.; Nakamachi, E.; Morita, Y.

    2015-12-01

    In this study, a high frequency piezoelectric energy harvester converted from the human low vibrated motion energy was newly developed. This hybrid energy harvester consists of the unimorph piezoelectric cantilever, the pendulum and a pair of permanent magnets. One magnet was attached at the edge of cantilever, and the counterpart magnet at the edge of pendulum. The mechanical energy provided through the human walking motion, which is a typical ubiquitous existence of vibration, is converted to the electric energy via the piezoelectric unimorph cantilever vibration. At first, we studied the energy convert mechanism and analyze the performance of novel energy harvester, where the resonance free vibration of unimorph piezoelectric cantilever generated a high electric power. Next, we equipped the counterpart permanent magnet at the edge of pendulum, which vibrates with a very low frequency caused by the human walking. Then the counterpart magnet was set at the edge of unimorph piezoelectric cantilever, which vibrated with a high frequency. This low-to-high frequency convert "dual vibration system" can be characterized as an enhanced energy harvester. We examined and obtained average values of voltage and power in this system, as 8.31 mV and 0.33 μW. Those results show the possibility to apply for the energy harvester in the portable and implantable Bio-MEMS devices.

  15. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    NASA Astrophysics Data System (ADS)

    Baumann, Fabian; Heucke, Stephan F.; Pippig, Diana A.; Gaub, Hermann E.

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  16. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    SciTech Connect

    Baumann, Fabian; Pippig, Diana A. Gaub, Hermann E.; Heucke, Stephan F.

    2015-03-15

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip’s surface unimpaired.

  17. Compact scanning-force microscope using a laser diode

    NASA Astrophysics Data System (ADS)

    Sarid, Dror; Iams, Doug; Weissenberger, Volker; Bell, L. Stephen

    1988-12-01

    The paper describes the operation of a compact scanning-force microscope in which the gradient of force acting on a vibrating tip is monitored by a diode laser and its integrated photodiode. The system does not require reflecting or focusing elements or complicated electronics. Experimental results using this system with magnetic domains on a magnetooptic storage medium attest to the feasibility of this concept.

  18. Magnetic resonance force microscopy with a permanent magnet on the cantilever

    SciTech Connect

    Zhang, Z.; Hammel, P.C.

    1997-02-01

    The magnetic resonance force microscope (MRFM) is a microscopic 3-D imaging instrument based on a recent proposal to detect magnetic resonance signals mechanically using a micro-mechanical resonator. MRFM has been successfully demonstrated in various magnetic resonance experiments including electron spin resonance, ferromagnetic resonances and nuclear magnetic resonance. In order to apply this ultra-high, 3-D spatial resolution technique to samples of arbitrary size and shape, the magnetic particle which generates the field gradient {del}{bold B}, (and, therefore, the force {bold F = (m {center_dot} {del}B)} between itself and the spin magnetization {bold m} of the sample) will need to be mounted on the mechanical resonator. Up to the present, all experiments have been performed with the sample mounted on the resonator. This is done, in part, to avoid the spurious response of the mechanical resonator which is generated by the variation of the magnetization of the magnetic particle as the external field is varied.

  19. Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

    SciTech Connect

    Evans, J. Chapman, S.

    2014-08-14

    Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

  20. Lubrication forces in air and accommodation coefficient measured by a thermal damping method using an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Honig, Christopher D. F.; Sader, John E.; Mulvaney, Paul; Ducker, William A.

    2010-05-01

    By analysis of the thermally driven oscillation of an atomic force microscope (AFM) cantilever, we have measured both the damping and static forces acting on a sphere near a flat plate immersed in gas. By varying the proximity of the sphere to the plate, we can continuously vary the Knudsen number (Kn) at constant pressure, thereby accessing the slip flow, transition, and molecular regimes at a single pressure. We use measurements in the slip-flow regime to determine the combined slip length (on both sphere and plate) and the tangential momentum accommodation coefficient, σ . For ambient air at 1 atm between two methylated glass solids, the inverse damping is linear with separation and the combined slip length on both surfaces is 250nm±100nm , which corresponds to σ=0.77±0.24 . At small separations (Kn>0.4) the measured inverse damping is no longer linear with separation, and is observed to exhibit reasonable agreement with the Vinogradova formula.

  1. Development of a hybrid atomic force microscopic measurement system combined with white light scanning interferometry.

    PubMed

    Guo, Tong; Wang, Siming; Dorantes-Gonzalez, Dante J; Chen, Jinping; Fu, Xing; Hu, Xiaotang

    2012-01-01

    A hybrid atomic force microscopic (AFM) measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning interferometric module and an AFM head are built. A compact AFM head is developed using a self-sensing tuning fork probe. The head need no external optical sensors to detect the deflection of the cantilever, which saves room on the head, and it can be directly fixed under an optical microscopic interferometric system. To enhance the system's dynamic response, the frequency modulation (FM) mode is adopted for the AFM head. The measuring data can be traceable through three laser interferometers in the system. The lateral scanning range can reach 25 mm × 25 mm by using a large-range positioning platform. A hybrid method combining AFM and white light scanning interferometry is proposed to improve the AFM measurement efficiency. In this method, the sample is measured firstly by white light scanning interferometry to get an overall coarse morphology, and then, further measured with higher resolution by AFM. Several measuring experiments on standard samples demonstrate the system's good measurement performance and feasibility of the hybrid measurement method.

  2. Radiation force of ultrasound as shear wave source in microscopic magnetic resonance elastography

    NASA Astrophysics Data System (ADS)

    Othman, Shadi F.; Ozer, M. Bulent; Xu, Huihui; Royston, Thomas J.; Magin, Richard L.

    2005-09-01

    Microscopic magnetic resonance elastography (micro-MRE) is a high-resolution imaging technique for measuring the viscoelastic properties of small synthetic and biological samples. Taking MRE to the microscopic scale requires stronger static fields, stronger magnetic field gradients, higher performance RF coils, and more compact, higher frequency shear wave actuators. Prior work by our group has been conducted at 11.74 T. A needle attached to a vibrating cantilever beam was placed in contact with the surface of the sample to generate shear waves up to 800 Hz. At higher frequencies, the excited shear waves attenuate within an extremely short distance such that only a very small region in the vicinity of the actuator can be studied due to inherent dynamic range limitations. In principle, modulated focused radiation force of US should be able to create a localized shear wave source within the test sample at a distance from the US transducer, thereby enabling micro-MRE probing of the sample at very high frequencies (up to 5 kHz). A confocal US transducer was fabricated to create such a source within the working constraints of the micro-MRE system. Initial feasibility studies are reviewed in this presentation. [Research supported by NIH Grant No. EB004885-01.

  3. A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials.

    PubMed

    Higuchi, Seiji; Kubo, Osamu; Kuramochi, Hiromi; Aono, Masakazu; Nakayama, Tomonobu

    2011-07-15

    Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.

  4. A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials

    NASA Astrophysics Data System (ADS)

    Higuchi, Seiji; Kubo, Osamu; Kuramochi, Hiromi; Aono, Masakazu; Nakayama, Tomonobu

    2011-07-01

    Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.

  5. Spanning the scales of granular materials through microscopic force imaging

    PubMed Central

    Brodu, Nicolas; Dijksman, Joshua A.; Behringer, Robert P.

    2015-01-01

    If you walk on sand, it supports your weight. How do the disordered forces between particles in sand organize, to keep you from sinking? This simple question is surprisingly difficult to answer experimentally: measuring forces in three dimensions, between deeply buried grains, is challenging. Here we describe experiments in which we have succeeded in measuring forces inside a granular packing subject to controlled deformations. We connect the measured micro-scale forces to the macro-scale packing force response with an averaging, mean field calculation. This calculation explains how the combination of packing structure and contact deformations produce the observed nontrivial mechanical response of the packing, revealing a surprising microscopic particle deformation enhancement mechanism. PMID:25739968

  6. Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

    NASA Astrophysics Data System (ADS)

    Seppä, Jeremias; Reischl, Bernhard; Sairanen, Hannu; Korpelainen, Virpi; Husu, Hannu; Heinonen, Martti; Raiteri, Paolo; Rohl, Andrew L.; Nordlund, Kai; Lassila, Antti

    2017-03-01

    Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected—both in experiments and simulations—factor in the interaction force between AFM probe and sample in air. This paper describes the humidity control system designed and built for the interferometrically traceable metrology AFM (IT-MAFM) at VTT MIKES. The humidity control is based on circulating the air of the AFM enclosure via dryer and humidifier paths with adjustable flow and mixing ratio of dry and humid air. The design humidity range of the system is 20–60 %rh. Force–distance adhesion studies at humidity levels between 25 %rh and 53 %rh are presented and compared to an atomistic molecular dynamics (MD) simulation. The uncertainty level of the thermal noise method implementation used for force constant calibration of the AFM cantilevers is 10 %, being the dominant component of the interaction force measurement uncertainty. Comparing the simulation and the experiment, the primary uncertainties are related to the nominally 7 nm radius and shape of measurement probe apex, possible wear and contamination, and the atomistic simulation technique details. The interaction forces are of the same order of magnitude in simulation and measurement (5 nN). An elongation of a few nanometres of the water meniscus between probe tip and sample, before its rupture, is seen in simulation upon retraction of the tip in higher humidity. This behaviour is also supported by the presented experimental measurement data but the data is insufficient to conclusively verify the quantitative meniscus elongation.

  7. Nonlocal and surface effects on the flutter instability of cantilevered nanotubes conveying fluid subjected to follower forces

    NASA Astrophysics Data System (ADS)

    Bahaadini, Reza; Hosseini, Mohammad; Jamalpoor, Ali

    2017-03-01

    On the basis of nonlocal elasticity theory, this paper studies the dynamic structural instability behavior of cantilever nanotubes conveying fluid incorporating end concentrated follower force and distributed tangential load, resting on the visco-Pasternak substrate. In order to improve the accuracy of the results, surface effects, i.e. surface elasticity and residual stresses are considered. Extended Hamilton's principle is implemented to obtain the nonlocal governing partial differential equation and related boundary conditions. Then, the extended Galerkin technique is used to convert partial differential equations into a general set of ordinary differential equations. Numerical results are expressed to reveal the variations of the critical flow velocity for flutter phenomenon of cantilever nanotubes with the various values of nonlocal parameter, mass ratios, nanotubes thickness, surface effects, various parameters of the visco-Pasternak medium, constant follower force and distributed compressive tangential load. Some numerical results of this research illustrated that the values of critical flutter flow velocity and stable region increase by considering surface effects. Also, critical flutter flow velocity decreases towards zero by increasing the value of the distributed compressive tangential load and constant follower force.

  8. Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool

    PubMed Central

    Parkin, John D

    2016-01-01

    Summary Micro- and nanocantilevers are employed in atomic force microscopy (AFM) and in micro- and nanoelectromechanical systems (MEMS and NEMS) as sensing elements. They enable nanomechanical measurements, are essential for the characterization of nanomaterials, and form an integral part of many nanoscale devices. Despite the fact that numerous methods described in the literature can be applied to determine the static flexural spring constant of micro- and nanocantilever sensors, experimental techniques that do not require contact between the sensor and a surface at some point during the calibration process are still the exception rather than the rule. We describe a noncontact method using a microfluidic force tool that produces accurate forces and demonstrate that this, in combination with a thermal noise spectrum, can provide the static flexural spring constant for cantilever sensors of different geometric shapes over a wide range of spring constant values (≈0.8–160 N/m). PMID:27335740

  9. Semi-automatic atomic force microscope for imaging in solution

    NASA Astrophysics Data System (ADS)

    Mou, Jianxun; Huang, Gang; Shao, Zhifeng

    1995-12-01

    A semiautomatic atomic force microscope for imaging in solution is described. With this new design, the laser beam is focused into a fine line, and a rotating mirror is used to deflect the optical signal onto a fixed photodetector. The alignment is now operated with stepper motors. Combined with a three stepper motor sequential advancement for tip engagement, the operation of the atomic force microscope for imaging in solution is much simplified, and the crashing of the tip is largely avoided. Since all controls are now coupled with stepper motors, this system is fully compatible with automation and operation in a self sealed temperature controlled chamber. The design and the construction of this system is relatively simple and can be fitted into any existing system.

  10. Atomic force microscope observations of otoconia in the newt

    NASA Technical Reports Server (NTRS)

    Hallworth, R.; Wiederhold, M. L.; Campbell, J. B.; Steyger, P. S.

    1995-01-01

    Calcitic and aragonitic otoconia from the Japanese red-bellied newt, Cynops pyrrhogaster, were examined using an atomic force microscope. The surface structure of both otoconial polymorphs consisted of arrays of elements approximately 50 nm in diameter. Elements were generally round and were separated by shallow depressions of no more than 20 nm. The elements are suggested to be single crystals of calcium carbonate. The relationship of these observations to theories of otoconial genesis is discussed.

  11. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

    PubMed Central

    Klocke, Michael

    2016-01-01

    Summary A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. PMID:27335760

  12. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

    PubMed

    Klocke, Michael; Wolf, Dietrich E

    2016-01-01

    A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechanism. When the long range ionic interaction is switched off, the two damping mechanisms occur with a completely different pattern, which is explained by the energy landscape for the apex atom of the tip. In this case the adhesion hysteresis is always associated with a distinct lateral displacement of the tip. It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively.

  13. Cantilever's behavior in the AC mode of an AFM

    SciTech Connect

    Nunes, V.B.; Zanette, S.I.; Caride, A.O.; Prioli, R.; Rivas, A.M.F

    2003-03-15

    In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence-from noncontact to tapping operating mode-on the height of the contamination layer and on the stiffness of the sample.

  14. Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication

    SciTech Connect

    An, Sangmin; Lee, Kunyoung; Kim, Bongsu; Noh, Haneol; Kim, Jongwoo; Kwon, Soyoung; Lee, Manhee; Hong, Mun-Heon; Jhe, Wonho

    2014-03-15

    This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopy and microscopy capabilities.

  15. Nanoscale Subsurface Imaging via Resonant Difference-Frequency Atomic Force Ultrasonic Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, Sean A.; Cantrell, John H.; Lilehei, Peter T.

    2007-01-01

    A novel scanning probe microscope methodology has been developed that employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by the fundamental resonance frequency of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever fundamental resonance. The resonance-enhanced difference-frequency signals are used to create images of embedded nanoscale features.

  16. Characterization of the photocurrents generated by the laser of atomic force microscopes.

    PubMed

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Iglesias, Vanessa; Lewis, David; Niu, Jiebin; Long, Shibing; Liu, Ming; Hofer, Alexander; Frammelsberger, Werner; Benstetter, Guenther; Scheuermann, Andrew; McIntyre, Paul C; Lanza, Mario

    2016-08-01

    The conductive atomic force microscope (CAFM) has become an essential tool for the nanoscale electronic characterization of many materials and devices. When studying photoactive samples, the laser used by the CAFM to detect the deflection of the cantilever can generate photocurrents that perturb the current signals collected, leading to unreliable characterization. In metal-coated semiconductor samples, this problem is further aggravated, and large currents above the nanometer range can be observed even without the application of any bias. Here we present the first characterization of the photocurrents introduced by the laser of the CAFM, and we quantify the amount of light arriving to the surface of the sample. The mechanisms for current collection when placing the CAFM tip on metal-coated photoactive samples are also analyzed in-depth. Finally, we successfully avoided the laser-induced perturbations using a two pass technique: the first scan collects the topography (laser ON) and the second collects the current (laser OFF). We also demonstrate that CAFMs without a laser (using a tuning fork for detecting the deflection of the tip) do not have this problem.

  17. A high-pressure atomic force microscope for imaging in supercritical carbon dioxide

    SciTech Connect

    Lea, A. S.; Higgins, S. R.; Knauss, K. G.; Rosso, K. M.

    2011-01-01

    A high-pressure atomic force microscope(AFM) that enables in situ, atomic scale measurements of topography of solid surfaces in contact with supercritical CO2 (scCO2) fluids has been developed. This apparatus overcomes the pressure limitations of the hydrothermal AFM and is designed to handle pressures up to 100 atm at temperatures up to ~350 K. A standard optically-based cantilever deflection detection system was chosen. When imaging in compressible supercritical fluids such as scCO2, precise control of pressure and temperature in the fluid cell is the primary technical challenge. Noise levels and imaging resolution depend on minimization of fluid density fluctuations that change the fluidrefractive index and hence the laser path. We demonstrate with our apparatus in situ atomic scale imaging of a calcite (CaCO3) mineral surface in scCO2; both single, monatomic steps and dynamic processes occurring on the (101¯4) surface are presented. Finally, this new AFM provides unprecedented in situ access to interfacial phenomena at solid–fluid interfaces under pressure.

  18. Digital atomic force microscope moiré method.

    PubMed

    Liu, Chia-Ming; Chen, Lien-Wen

    2004-11-01

    In this study, a novel digital atomic force microscope (AFM) moiré method is established to measure the displacement and strain fields. The moiré pattern is generated by the interference between the specimen grating and the virtual reference grating formed by digital image processes. The overlapped image is filtered by the 2-D wavelet transformation to obtain clear interference moiré patterns. From moiré patterns, the displacement and strain fields can be analyzed. The experimental results show that the digital AFM moiré method is very sensitive and easy to realize in nanoscale measurements.

  19. Sampling Protein Form and Function with the Atomic Force Microscope*

    PubMed Central

    Baclayon, Marian; Roos, Wouter H.; Wuite, Gijs J. L.

    2010-01-01

    To study the structure, function, and interactions of proteins, a plethora of techniques is available. Many techniques sample such parameters in non-physiological environments (e.g. in air, ice, or vacuum). Atomic force microscopy (AFM), however, is a powerful biophysical technique that can probe these parameters under physiological buffer conditions. With the atomic force microscope operating under such conditions, it is possible to obtain images of biological structures without requiring labeling and to follow dynamic processes in real time. Furthermore, by operating in force spectroscopy mode, it can probe intramolecular interactions and binding strengths. In structural biology, it has proven its ability to image proteins and protein conformational changes at submolecular resolution, and in proteomics, it is developing as a tool to map surface proteomes and to study protein function by force spectroscopy methods. The power of AFM to combine studies of protein form and protein function enables bridging various research fields to come to a comprehensive, molecular level picture of biological processes. We review the use of AFM imaging and force spectroscopy techniques and discuss the major advances of these experiments in further understanding form and function of proteins at the nanoscale in physiologically relevant environments. PMID:20562411

  20. Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling.

    PubMed

    Torun, H; Finkler, O; Degertekin, F L

    2009-07-01

    The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a separate feedback loop for thermal drift compensation, and the differential signal can be used to cancel the shift in zero-force level of the AFM.

  1. Stretching of Single Polymer Chains Using the Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Ortiz, C.; van der Vegte, E. W.; van Swieten, E.; Robillard, G. T.; Hadziioannou, G.

    1998-03-01

    A variety of macroscopic phenomenon involve "nanoscale" polymer deformation including rubber elasticity, shear yielding, strain hardening, stress relaxation, fracture, and flow. With the advent of new and improved experimental techniques, such as the atomic force microscope (AFM), the probing of physical properties of polymers has reached finer and finer scales. The development of mixed self-assembling monolayer techniques and the chemical functionalization of AFM probe tips has allowed for mechanical experiments on single polymer chains of molecular dimensions. In our experiments, mixed monolayers are prepared in which end-functionalized, flexible polymer chains of thiol-terminated poly(methacrylic acid) are covalently bonded, isolated, and randomly distributed on gold substrates. The coils are then imaged, tethered to a gold-coated AFM tip, and stretched between the tip and the substrate in a conventional force / distance experiment. An increase in the attractive force due to entropic, elastic resistance to stretching, as well as fracture of the polymer chain is observed. The effect of chain stiffness, topological constraints, strain rate, mechanical hysteresis, and stress relaxation were investigated. Force modulation techniques were also employed in order to image the viscoelastic character of the polymer chains. Parallel work includes similar studies of biological systems such as wheat gluten proteins and polypeptides.

  2. Scanning thermal-conductivity microscope

    NASA Astrophysics Data System (ADS)

    Sarid, Dror; McCarthy, Brendan; Grover, Ranjan

    2006-02-01

    This article describes a novel implementation of an atomic force microscope that can map thermal-conductivity features across a sample with a high spatial resolution. The microscope employs a single-sided, metal-coated cantilever, which acts as a bimetallic strip together with a heating laser whose beam is focused on the cantilever's free end, on the opposite side of its tip. Subtracting the topography obtained by the unheated and heated cantilevers yields a map of thermal conductivity across the surface of a sample. The article presents (a) the theory of operation of the microscope and (b) the experimental results obtained on a silicon sample with oxide features, showing good agreement between the two.

  3. Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy

    NASA Astrophysics Data System (ADS)

    Olson, Stephen; Sankaran, Balasubramanian; Altemus, Bruce; Xu, Bai; Geer, Robert

    2005-05-01

    Although the conventional optical lever technology typically used for scanning probe microscope applications has proven highly sensitive, accurate, and cost effective for most applications involving micromachined cantilever deflection measurements, frequency limitations and space needs limit its applicability to emerging ultrasonic-based SPM applications. Recently, the fabrication of cantilevers integrated with actuation and sensing components has opened avenues for feedback-based driving of micromachined cantilevers at higher-order resonance frequencies while sensing average deflection without the need for an optical deflection pathway for average deflection sensing. The work presented here will review recent efforts by our group in fabricating micromachined cantilevers with integrated piezoresistive deflection-sensing components combined with integrated ZnO actuation layers to induce cantilever deflection. These cantilevers are being fabricated for use in a heterodyne force microscopy system (HFM) to enable SPM imaging contrast based on viscoelastic response of a surface in contact with a micromachined tip wherein active-feedback technology is being applied to maintain ultrasonic tip excitation at higher order cantilever resonances. The first and second-pass fabrication results will be presented and reviewed regarding cantilever release and ZnO actuator (and electrode) fabrication. Dynamic response data from these structures, measured via laser Doppler vibrometery reveal the expected resonance structure for a cantilever of these dimensions.

  4. A new ion sensing deep atomic force microscope

    SciTech Connect

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  5. Quantitative Membrane Electrostatics with the Atomic Force Microscope

    PubMed Central

    Yang, Yi; Mayer, Kathryn M.; Hafner, Jason H.

    2007-01-01

    The atomic force microscope (AFM) is sensitive to electric double layer interactions in electrolyte solutions, but provides only a qualitative view of interfacial electrostatics. We have fully characterized silicon nitride probe tips and other experimental parameters to allow a quantitative electrostatic analysis by AFM, and we have tested the validity of a simple analytical force expression through numerical simulations. As a test sample, we have measured the effective surface charge density of supported zwitterionic dioleoylphosphatidylcholine membranes with a variable fraction of anionic dioleoylphosphatidylserine. The resulting surface charge density and surface potential values are in quantitative agreement with those predicted by the Gouy-Chapman-Stern model of membrane charge regulation, but only when the numerical analysis is employed. In addition, we demonstrate that the AFM can detect double layer forces at a separation of several screening lengths, and that the probe only perturbs the membrane surface potential by <2%. Finally, we demonstrate 50-nm resolution electrostatic mapping on heterogeneous model membranes with the AFM. This novel combination of capabilities demonstrates that the AFM is a unique and powerful probe of membrane electrostatics. PMID:17158563

  6. Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

    PubMed Central

    Ganser, Christian; Fritz-Popovski, Gerhard; Morak, Roland; Sharifi, Parvin; Marmiroli, Benedetta; Sartori, Barbara; Amenitsch, Heinz; Griesser, Thomas; Teichert, Christian

    2016-01-01

    Summary We use a soft templating approach in combination with evaporation induced self-assembly to prepare mesoporous films containing cylindrical pores with elliptical cross-section on an ordered pore lattice. The film is deposited on silicon-based commercial atomic force microscope (AFM) cantilevers using dip coating. This bilayer cantilever is mounted in a humidity controlled AFM, and its deflection is measured as a function of relative humidity. We also investigate a similar film on bulk silicon substrate using grazing-incidence small-angle X-ray scattering (GISAXS), in order to determine nanostructural parameters of the film as well as the water-sorption-induced deformation of the ordered mesopore lattice. The strain of the mesoporous layer is related to the cantilever deflection using simple bilayer bending theory. We also develop a simple quantitative model for cantilever deflection which only requires cantilever geometry and nanostructural parameters of the porous layer as input parameters. PMID:27335753

  7. Controlling the opto-mechanics of a cantilever in an interferometer via cavity loss

    SciTech Connect

    Schmidsfeld, A. von Reichling, M.

    2015-09-21

    In a non-contact atomic force microscope, based on interferometric cantilever displacement detection, the optical return loss of the system is tunable via the distance between the fiber end and the cantilever. We utilize this for tuning the interferometer from a predominant Michelson to a predominant Fabry-Pérot characteristics and introduce the Fabry-Pérot enhancement factor as a quantitative measure for multibeam interference in the cavity. This experimentally easily accessible and adjustable parameter provides a control of the opto-mechanical interaction between the cavity light field and the cantilever. The quantitative assessment of the light pressure acting on the cantilever oscillating in the cavity via the frequency shift allows an in-situ measurement of the cantilever stiffness with remarkable precision.

  8. Controlling the opto-mechanics of a cantilever in an interferometer via cavity loss

    NASA Astrophysics Data System (ADS)

    von Schmidsfeld, A.; Reichling, M.

    2015-09-01

    In a non-contact atomic force microscope, based on interferometric cantilever displacement detection, the optical return loss of the system is tunable via the distance between the fiber end and the cantilever. We utilize this for tuning the interferometer from a predominant Michelson to a predominant Fabry-Pérot characteristics and introduce the Fabry-Pérot enhancement factor as a quantitative measure for multibeam interference in the cavity. This experimentally easily accessible and adjustable parameter provides a control of the opto-mechanical interaction between the cavity light field and the cantilever. The quantitative assessment of the light pressure acting on the cantilever oscillating in the cavity via the frequency shift allows an in-situ measurement of the cantilever stiffness with remarkable precision.

  9. The long range voice coil atomic force microscope

    SciTech Connect

    Barnard, H.; Randall, C.; Bridges, D.; Hansma, P. K.

    2012-02-15

    Most current atomic force microscopes (AFMs) use piezoelectric ceramics for scan actuation. Piezoelectric ceramics provide precision motion with fast response to applied voltage potential. A drawback to piezoelectric ceramics is their inherently limited ranges. For many samples this is a nonissue, as imaging the nanoscale details is the goal. However, a key advantage of AFM over other microscopy techniques is its ability to image biological samples in aqueous buffer. Many biological specimens have topography for which the range of piezoactuated stages is limiting, a notable example of which is bone. In this article, we present the use of voice coils in scan actuation for an actuation range in the Z-axis an order of magnitude larger than any AFM commercially available today. The increased scan size will allow for imaging an important new variety of samples, including bone fractures.

  10. The long range voice coil atomic force microscope

    PubMed Central

    Barnard, H.; Randall, C.; Bridges, D.; Hansma, P. K.

    2012-01-01

    Most current atomic force microscopes (AFMs) use piezoelectric ceramics for scan actuation. Piezoelectric ceramics provide precision motion with fast response to applied voltage potential. A drawback to piezoelectric ceramics is their inherently limited ranges. For many samples this is a nonissue, as imaging the nanoscale details is the goal. However, a key advantage of AFM over other microscopy techniques is its ability to image biological samples in aqueous buffer. Many biological specimens have topography for which the range of piezoactuated stages is limiting, a notable example of which is bone. In this article, we present the use of voice coils in scan actuation for an actuation range in the Z-axis an order of magnitude larger than any AFM commercially available today. The increased scan size will allow for imaging an important new variety of samples, including bone fractures. PMID:22380097

  11. Research on three dimensional machining effects using atomic force microscope

    NASA Astrophysics Data System (ADS)

    Mao, Yao-Ting; Kuo, Kai-Chen; Tseng, Ching-En; Huang, Jian-Yin; Lai, Yi-Chih; Yen, Jia-Yush; Lee, Chih-Kung; Chuang, Wei-Li

    2009-06-01

    This research studies the use of scanning probe microscope as the tool to manufacture three dimensional nanoscale objects. We modified a commercial atomic force microscope (AFM) and replaced the original probe control system with a personal computer (PC) based controller. The modified system used the scanning probe in the AFM for the cutting tool and used the PC controller to control work piece. With the new controller, one could implement multiaxes motion control to perform trajectory planning and to test various cutting strategies. The experiments discovered that the debris can coalesce with the sample material and cause tremendous problem in the nanomachining process. This research thus proposed to make use of this material and developed a piling algorithm to not only cut but also pile up the debris in a favorable way for steric shaping. The experimental results showed that the proposed cutting and shaping algorithm can produce nano-objects as high as a few hundred nanometers. The probe tip typically wears down to around 500 μm diameter after the machining process, putting a limit on the machining resolution. The vertical resolution can achieve less than 10 nm without controlled environment.

  12. The magnetic resonance force microscope: A new microscopic probe of magnetic materials

    SciTech Connect

    Hammel, P.C.; Zhang, Z.; Midzor, M.; Roukes, M.L.; Wigen, P.E.; Childress, J.R.

    1997-08-06

    The magnetic resonance force microscope (MRFM) marries the techniques of magnetic resonance imaging (MRI) and atomic force microscopy (AFM), to produce a three-dimensional imaging instrument with high, potentially atomic-scale, resolution. The principle of the MRFM has been successfully demonstrated in numerous experiments. By virtue of its unique capabilities the MRFM shows promise to make important contributions in fields ranging from three-dimensional materials characterization to bio-molecular structure determination. Here the authors focus on its application to the characterization and study of layered magnetic materials; the ability to illuminate the properties of buried interfaces in such materials is a particularly important goal. While sensitivity and spatial resolution are currently still far from their theoretical limits, they are nonetheless comparable to or superior to that achievable in conventional MRI. Further improvement of the MRFM will involve operation at lower temperature, application of larger field gradients, introduction of advanced mechanical resonators and improved reduction of the spurious coupling when the magnet is on the resonator.

  13. Triaxial Atomic Force Microscope Contact-Free Tweezers for Nanoassembly

    PubMed Central

    Brown, Keith A; Westervelt, Robert M

    2010-01-01

    We propose a Traixial Atomic Force Microscope (AFM) Contact-free Tweezer (TACT) for the controlled assembly of nanoparticles suspended in a liquid. The TACT overcomes four major challenges faced in nanoassembly: (1) The TACT can hold and position a single nanoparticle with spatial accuracy smaller than the nanoparticle size (~ 5 nm). (2) The nanoparticle is held away from the surface of the TACT by negative dielectrophoresis (nDEP) to prevent van der Waals forces from sticking it to the TACT. (3) The TACT holds nanoparticles in a trap that is size-matched to the particle and surrounded by a repulsive region so that it will only trap a single particle at a time. (4) The trap can hold a semiconductor nanoparticle in water with a trapping energy greater than thermal energy. For example, a 5 nm radius silicon nanoparticle is held with 10 kBT at room temperature. We propose methods for using the TACT as a nanoscale pick-and-place tool to assemble semiconductor quantum dots, biological molecules, semiconductor nanowires, and carbon nanotubes. PMID:19713582

  14. Cantilever biosensors.

    PubMed

    Fritz, Jürgen

    2008-07-01

    This review will provide a general introduction to the field of cantilever biosensors by discussing the basic principles and the basic technical background necessary to understand and evaluate this class of sensors. Microfabricated cantilever sensors respond to changes in their environment or changes on their surface with a mechanical bending in the order of nanometers which can easily be detected. They are able to detect pH and temperature changes, the formation of self-assembled monolayers, DNA hybridization, antibody-antigen interactions, or the adsorption of bacteria. The review will focus on the surface stress mode of microfabricated cantilever arrays and their application as biosensors in molecular life science. A general background on biosensors, an overview of the different modes of operation of cantilever sensors and some details on sensor functionalization will be given. Finally, key experiments and current theoretical efforts to describe the surface stress mode of cantilever sensors will be discussed.

  15. Evaluation of carbon nanotube probes in critical dimension atomic force microscopes.

    PubMed

    Choi, Jinho; Park, Byong Chon; Ahn, Sang Jung; Kim, Dal-Hyun; Lyou, Joon; Dixson, Ronald G; Orji, Ndubuisi G; Fu, Joseph; Vorburger, Theodore V

    2016-07-01

    The decreasing size of semiconductor features and the increasing structural complexity of advanced devices have placed continuously greater demands on manufacturing metrology, arising both from the measurement challenges of smaller feature sizes and the growing requirement to characterize structures in more than just a single critical dimension. For scanning electron microscopy, this has resulted in increasing sophistication of imaging models. For critical dimension atomic force microscopes (CD-AFMs), this has resulted in the need for smaller and more complex tips. Carbon nanotube (CNT) tips have thus been the focus of much interest and effort by a number of researchers. However, there have been significant issues surrounding both the manufacture and use of CNT tips. Specifically, the growth or attachment of CNTs to AFM cantilevers has been a challenge to the fabrication of CNT tips, and the flexibility and resultant bending artifacts have presented challenges to using CNT tips. The Korea Research Institute for Standards and Science (KRISS) has invested considerable effort in the controlled fabrication of CNT tips and is collaborating with the National Institute of Standards and Technology on the application of CNT tips for CD-AFM. Progress by KRISS on the precise control of CNT orientation, length, and end modification, using manipulation and focused ion beam processes, has allowed us to implement ball-capped CNT tips and bent CNT tips for CD-AFM. Using two different generations of CD-AFM instruments, we have evaluated these tip types by imaging a line/space grating and a programmed line edge roughness specimen. We concluded that these CNTs are capable of scanning the profiles of these structures, including re-entrant sidewalls, but there remain important challenges to address. These challenges include tighter control of tip geometry and careful optimization of scan parameters and algorithms for using CNT tips.

  16. Evaluation of carbon nanotube probes in critical dimension atomic force microscopes

    NASA Astrophysics Data System (ADS)

    Choi, Jinho; Park, Byong Chon; Ahn, Sang Jung; Kim, Dal-Hyun; Lyou, Joon; Dixson, Ronald G.; Orji, Ndubuisi G.; Fu, Joseph; Vorburger, Theodore V.

    2016-07-01

    The decreasing size of semiconductor features and the increasing structural complexity of advanced devices have placed continuously greater demands on manufacturing metrology, arising both from the measurement challenges of smaller feature sizes and the growing requirement to characterize structures in more than just a single critical dimension. For scanning electron microscopy, this has resulted in increasing sophistication of imaging models. For critical dimension atomic force microscopes (CD-AFMs), this has resulted in the need for smaller and more complex tips. Carbon nanotube (CNT) tips have thus been the focus of much interest and effort by a number of researchers. However, there have been significant issues surrounding both the manufacture and use of CNT tips. Specifically, the growth or attachment of CNTs to AFM cantilevers has been a challenge to the fabrication of CNT tips, and the flexibility and resultant bending artifacts have presented challenges to using CNT tips. The Korea Research Institute for Standards and Science (KRISS) has invested considerable effort in the controlled fabrication of CNT tips and is collaborating with the National Institute of Standards and Technology on the application of CNT tips for CD-AFM. Progress by KRISS on the precise control of CNT orientation, length, and end modification, using manipulation and focused ion beam processes, has allowed us to implement ball-capped CNT tips and bent CNT tips for CD-AFM. Using two different generations of CD-AFM instruments, we have evaluated these tip types by imaging a line/space grating and a programmed line edge roughness specimen. We concluded that these CNTs are capable of scanning the profiles of these structures, including re-entrant sidewalls, but there remain important challenges to address. These challenges include tighter control of tip geometry and careful optimization of scan parameters and algorithms for using CNT tips.

  17. Evaluation of carbon nanotube probes in critical dimension atomic force microscopes

    PubMed Central

    Choi, Jinho; Park, Byong Chon; Ahn, Sang Jung; Kim, Dal-Hyun; Lyou, Joon; Dixson, Ronald G.; Orji, Ndubuisi G.; Fu, Joseph; Vorburger, Theodore V.

    2016-01-01

    The decreasing size of semiconductor features and the increasing structural complexity of advanced devices have placed continuously greater demands on manufacturing metrology, arising both from the measurement challenges of smaller feature sizes and the growing requirement to characterize structures in more than just a single critical dimension. For scanning electron microscopy, this has resulted in increasing sophistication of imaging models. For critical dimension atomic force microscopes (CD-AFMs), this has resulted in the need for smaller and more complex tips. Carbon nanotube (CNT) tips have thus been the focus of much interest and effort by a number of researchers. However, there have been significant issues surrounding both the manufacture and use of CNT tips. Specifically, the growth or attachment of CNTs to AFM cantilevers has been a challenge to the fabrication of CNT tips, and the flexibility and resultant bending artifacts have presented challenges to using CNT tips. The Korea Research Institute for Standards and Science (KRISS) has invested considerable effort in the controlled fabrication of CNT tips and is collaborating with the National Institute of Standards and Technology on the application of CNT tips for CD-AFM. Progress by KRISS on the precise control of CNT orientation, length, and end modification, using manipulation and focused ion beam processes, has allowed us to implement ball-capped CNT tips and bent CNT tips for CD-AFM. Using two different generations of CD-AFM instruments, we have evaluated these tip types by imaging a line/space grating and a programmed line edge roughness specimen. We concluded that these CNTs are capable of scanning the profiles of these structures, including re-entrant sidewalls, but there remain important challenges to address. These challenges include tighter control of tip geometry and careful optimization of scan parameters and algorithms for using CNT tips. PMID:27840664

  18. Investigation on flow and mixing characteristics of supersonic mixing layer induced by forced vibration of cantilever

    NASA Astrophysics Data System (ADS)

    Zhang, Dongdong; Tan, Jianguo; Lv, Liang

    2015-12-01

    The mixing process has been an important issue for the design of supersonic combustion ramjet engine, and the mixing efficiency plays a crucial role in the improvement of the combustion efficiency. In the present study, nanoparticle-based planar laser scattering (NPLS), particle image velocimetry (PIV) and large eddy simulation (LES) are employed to investigate the flow and mixing characteristics of supersonic mixing layer under different forced vibration conditions. The indexes of fractal dimension, mixing layer thickness, momentum thickness and scalar mixing level are applied to describe the mixing process. Results show that different from the development and evolution of supersonic mixing layer without vibration, the flow under forced vibration is more likely to present the characteristics of three-dimensionality. The laminar flow region of mixing layer under forced vibration is greatly shortened and the scales of rolled up Kelvin-Helmholtz vortices become larger, which promote the mixing process remarkably. The fractal dimension distribution reveals that comparing with the flow without vibration, the turbulent fluctuation of supersonic mixing layer under forced vibration is more intense. Besides, the distribution of mixing layer thickness, momentum thickness and scalar mixing level are strongly influenced by forced vibration. Especially, when the forcing frequency is 4000 Hz, the mixing layer thickness and momentum thickness are 0.0391 m and 0.0222 m at the far field of 0.16 m, 83% and 131% higher than that without vibration at the same position, respectively.

  19. Tooth structure studied using the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Kasas, Sandor; Berdal, Ariane; Celio, Marco R.

    1993-06-01

    We used the atomic force microscope (AFM) to observe structure of the tooth, both rat and human. The rigidity and the surface flatness of thin sections of this mineralized tissue, allow us to attain good resolution with the AFM. As enamel contains uniquely large crystals of hydroxyapatite it can be investigated at high resolution. Tooth enamel and thin slices of undecalcified developing tooth germs from 2 - 12 day old rats were observed, embedded in acrylic resin (Lowicryl K4M). In addition, as orthophosphoric acid is widely used clinically to etch tooth enamel before restoring with composites, we studied its action at pH2 on the tooth surface during 1 hour of exposition. Hydroxyapatite crystals and collagen fibers were seen in the tooth slices observed in air, and the classical structure of the enamel was visible. The etched enamel surface under liquid, showed dramatic differences to that imaged in air. Modifications to the surface were also seen during exposure to the acid.

  20. Note: Determination of torsional spring constant of atomic force microscopy cantilevers: combining normal spring constant and classical beam theory.

    PubMed

    Álvarez-Asencio, R; Thormann, E; Rutland, M W

    2013-09-01

    A technique has been developed for the calculation of torsional spring constants for AFM cantilevers based on the combination of the normal spring constant and plate/beam theory. It is easy to apply and allow the determination of torsional constants for stiff cantilevers where the thermal power spectrum is difficult to obtain due to the high resonance frequency and low signal/noise ratio. The applicability is shown to be general and this simple approach can thus be used to obtain torsional constants for any beam shaped cantilever.

  1. SI-traceable determination of the spring constant of a soft cantilever using the nanonewton force facility based on electrostatic methods

    NASA Astrophysics Data System (ADS)

    Nesterov, V.; Belai, O.; Nies, D.; Buetefisch, S.; Mueller, M.; Ahbe, T.; Naparty, D.; Popadic, R.; Wolff, H.

    2016-08-01

    The PTB’s (Physikalisch-Technische Bundesanstalt, Germany) nanonewton force facility, first presented in work by Nesterov (2007 Meas. Sci. Technol. 18 360-6), Nesterov (2009 Meas. Sci. Technol. 20 084012) and Nesterov et al (2009 Metrologia 46 277-82), has been significantly improved and used to measure the stiffness of a cantilever. The facility is based on a disc pendulum with electrostatic reduction of its deflection and stiffness. In this paper, we will demonstrate that the facility is able to measure horizontal forces in the range below 1 μN with a resolution below 5 pN and an uncertainty below 2.7% for a measured force of 1 nN at a measurement duration of about 20 s. We will demonstrate the possibility of using this facility as a calibration device that can accurately determine spring constants of soft cantilevers (K ≲ 0.1 N m-1) with traceability to the SI units. The method and the results of measuring the spring constant of a soft cantilever (K  =  0.125 N m-1) in air, in a medium vacuum, in a high vacuum and in nitrogen are presented. We will show that a relative standard uncertainty of the spring constant calibration of better than 0.3% (measurement in a medium vacuum) and a repeatability of better than 0.04% are achieved.

  2. Development of a nano manipulator based on an atomic force microscope coupled with a haptic device: a novel manipulation tool for scanning electron microscopy.

    PubMed

    Iwata, Futoshi; Kawanishi, Shinsuke; Aoyama, Hisayuki; Ushiki, Tatsuo

    2009-01-01

    We developed a novel nano manipulator based on an atomic force microscope (AFM) that can be operated inside the sample chamber of a scanning electron microscope (SEM). This AFM manipulator is also coupled with a haptic device, and the nanometer-scale movement of the AFM cantilever can be scaled up to the millimeter-scale movement of the pen handle of the haptic device. Using this AFM manipulation system, we were able to observe the AFM cantilever and samples under the SEM and obtain topographical images of the AFM under the SEM. These AFM images contained quantitative height information of the sample that is difficult to obtain from SEM images. Our system was also useful for positioning the cantilever for accurate AFM manipulation because the manipulation scene could be directly observed in real time by SEM. Coupling of the AFM manipulator with the haptic device was also useful for manipulation in the SEM since the operator can move the AFM probe freely at any position on the sample surface while feeling the interaction force between the probe and the sample surface. We tested two types of cutting methods: simple cutting and vibration cutting. Our results showed that vibration cutting with probe oscillation is very useful for the dissection of biological samples which were dried for SEM observation. Thus, cultivated HeLa cells were successfully micro-dissected by vibration cutting, and the dissection process could be observed in real time in the SEM. This AFM manipulation system is expected to serve as a powerful tool for dissecting various biological samples at the micro and nanometer-scale under SEM observation.

  3. Laser interferometry force-feedback sensor for an interfacial force microscope

    DOEpatents

    Houston, Jack E.; Smith, William L.

    2004-04-13

    A scanning force microscope is provided with a force-feedback sensor to increase sensitivity and stability in determining interfacial forces between a probe and a sample. The sensor utilizes an interferometry technique that uses a collimated light beam directed onto a deflecting member, comprising a common plate suspended above capacitor electrodes situated on a substrate forming an interference cavity with a probe on the side of the common plate opposite the side suspended above capacitor electrodes. The probe interacts with the surface of the sample and the intensity of the reflected beam is measured and used to determine the change in displacement of the probe to the sample and to control the probe distance relative to the surface of the sample.

  4. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    SciTech Connect

    Iwata, Futoshi; Adachi, Makoto; Hashimoto, Shigetaka

    2015-10-07

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  5. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    NASA Astrophysics Data System (ADS)

    Iwata, Futoshi; Adachi, Makoto; Hashimoto, Shigetaka

    2015-10-01

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  6. Contact resonances of U-shaped atomic force microscope probes

    SciTech Connect

    Rezaei, E.; Turner, J. A.

    2016-01-21

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes.

  7. Characterization of a two-dimensional cantilever array with through-wafer electrical interconnects

    NASA Astrophysics Data System (ADS)

    Chow, Eugene M.; Yaralioglu, Goksen G.; Quate, Calvin F.; Kenny, Thomas W.

    2002-01-01

    The characterization of two-dimensional micromachined silicon cantilever arrays with integrated through-wafer electrical interconnects is presented. The approach addresses alignment and density issues associated with operating two-dimensional scanning probe arrays. The tungsten based interconnect (30 μm diameter, 1 Ω resistance) is shown not to degrade the sensitivity of the piezoresistive deflection sensor embedded on each cantilever. Operation of the array (up to 2×7) as a microscope for imaging large areas (3.8×0.45 mm2) and with vertical row stitching is demonstrated with images of samples orders of magnitude larger than images possible with standard atomic force microscope techniques.

  8. Fast nanotopography imaging using a high speed cantilever with integrated heater-thermometer

    NASA Astrophysics Data System (ADS)

    Lee, Byeonghee; Somnath, Suhas; King, William P.

    2013-04-01

    This paper presents a high speed tapping cantilever with an integrated heater-thermometer for fast nanotopography imaging. The cantilever is much smaller and faster than previous heated cantilevers, with a length of 35 μm and a resonant frequency of 1.4 MHz. The mechanical response time is characterized by scanning over a backward-facing step of height 20 nm. The mechanical response time is 77 μs in air and 448 μs in water, which compares favorably to the fastest commercial cantilevers that do not have integrated heaters. The doped silicon cantilever is designed with an integrated heater that can heat and cool in about 10 μs and can operate in both air and water. We demonstrate standard laser-based topography imaging along with thermal topography imaging, when the cantilever is actuated via the piezoelectric shaker in an atomic force microscope system and when it is actuated by Lorentz forces. The cantilever can perform thermal topography imaging in tapping mode with an imaging resolution of 7 nm at a scan speed of 1.46 mm s-1.

  9. Fast nanotopography imaging using a high speed cantilever with integrated heater-thermometer.

    PubMed

    Lee, Byeonghee; Somnath, Suhas; King, William P

    2013-04-05

    This paper presents a high speed tapping cantilever with an integrated heater-thermometer for fast nanotopography imaging. The cantilever is much smaller and faster than previous heated cantilevers, with a length of 35 μm and a resonant frequency of 1.4 MHz. The mechanical response time is characterized by scanning over a backward-facing step of height 20 nm. The mechanical response time is 77 μs in air and 448 μs in water, which compares favorably to the fastest commercial cantilevers that do not have integrated heaters. The doped silicon cantilever is designed with an integrated heater that can heat and cool in about 10 μs and can operate in both air and water. We demonstrate standard laser-based topography imaging along with thermal topography imaging, when the cantilever is actuated via the piezoelectric shaker in an atomic force microscope system and when it is actuated by Lorentz forces. The cantilever can perform thermal topography imaging in tapping mode with an imaging resolution of 7 nm at a scan speed of 1.46 mm s(-1).

  10. Micro-/nanosized cantilever beams and mass sensors under applied axial tensile/compressive force vibrating in vacuum and viscous fluid

    SciTech Connect

    Stachiv, Ivo; Fang, Te-Hua; Chen, Tao-Hsing

    2015-11-15

    Vibrating micro-/nanosized cantilever beams under an applied axial force are the key components of various devices used in nanotechnology. In this study, we perform a complete theoretical investigation of the cantilever beams under an arbitrary value of the axial force vibrating in a specific environment such as vacuum, air or viscous fluid. Based on the results easy accessible expressions enabling one the fast and highly accurate estimations of changes in the Q-factor and resonant frequencies of beam oscillating in viscous fluid caused by the applied axial force are derived and analyzed. It has been also shown that for beam-to-string and string vibrational regimes the mode shape starts to significantly deviate from the one known for a beam without axial force. Moreover, a linear dependency of the vibrational amplitude in resonance on the dimensionless tension parameter has been found. We revealed that only a large axial force, i.e. the string vibrational regime, significantly improves the Q-factor of beams submerged in fluid, while an increase of the axial force in beam and beam-to-string transition regimes has a negligibly small impact on the Q-factor enhancement. Experiments carried out on the carbon nanotubes and nanowires are in a good agreement with present theoretical predictions.

  11. An open source/real-time atomic force microscope architecture to perform customizable force spectroscopy experiments.

    PubMed

    Materassi, Donatello; Baschieri, Paolo; Tiribilli, Bruno; Zuccheri, Giampaolo; Samorì, Bruno

    2009-08-01

    We describe the realization of an atomic force microscope architecture designed to perform customizable experiments in a flexible and automatic way. Novel technological contributions are given by the software implementation platform (RTAI-LINUX), which is free and open source, and from a functional point of view, by the implementation of hard real-time control algorithms. Some other technical solutions such as a new way to estimate the optical lever constant are described as well. The adoption of this architecture provides many degrees of freedom in the device behavior and, furthermore, allows one to obtain a flexible experimental instrument at a relatively low cost. In particular, we show how such a system has been employed to obtain measures in sophisticated single-molecule force spectroscopy experiments [Fernandez and Li, Science 303, 1674 (2004)]. Experimental results on proteins already studied using the same methodologies are provided in order to show the reliability of the measure system.

  12. Tuning the Spring Constant of Cantilever-free Probe Arrays

    NASA Astrophysics Data System (ADS)

    Eichelsdoerfer, Daniel J.; Brown, Keith A.; Boya, Radha; Shim, Wooyoung; Mirkin, Chad A.

    2013-03-01

    The versatility of atomic force microscope (AFM) based techniques such as scanning probe lithography is due in part to the utilization of a cantilever that can be fabricated to match a desired application. In contrast, cantilever-free scanning probe lithography utilizes a low cost array of probes on a compliant backing layer that allows for high throughput nanofabrication but lacks the tailorability afforded by the cantilever in traditional AFM. Here, we present a method to measure and tune the spring constant of probes in a cantilever-free array by adjusting the mechanical properties of the underlying elastomeric layer. Using this technique, we are able to fabricate large-area silicon probe arrays with spring constants that can be tuned in the range from 7 to 150 N/m. This technique offers an advantage in that the spring constant depends linearly on the geometry of the probe, which is in contrast to traditional cantilever-based lithography where the spring constant varies as the cube of the beam width and thickness. To illustrate the benefit of utilizing a probe array with a lower spring constant, we pattern a block copolymer on a delicate 50 nm thick silicon nitride window.

  13. A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

    SciTech Connect

    Steurer, Wolfram Gross, Leo; Schlittler, Reto R.; Meyer, Gerhard

    2014-02-15

    We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K.

  14. Investigation of Acoustic Fields Generated by Eddy Currents Using an Atomic Force Microscope (Postprint)

    DTIC Science & Technology

    2012-08-01

    AFRL-RX-WP-JA-2014-0230 INVESTIGATION OF ACOUSTIC FIELDS GENERATED BY EDDY CURRENTS USING AN ATOMIC FORCE MICROSCOPE (POSTPRINT) V...Institute of Physics AIR FORCE RESEARCH LABORATORY MATERIALS AND MANUFACTURING DIRECTORATE WRIGHT-PATTERSON AIR FORCE BASE, OH 45433-7750 AIR... FORCE MATERIEL COMMAND UNITED STATES AIR FORCE NOTICE AND SIGNATURE PAGE Using Government drawings, specifications, or other data included in

  15. Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics.

    PubMed

    Kageshima, Masami; Chikamoto, Takuma; Ogawa, Tatsuya; Hirata, Yoshiki; Inoue, Takahito; Naitoh, Yoshitaka; Li, Yan Jun; Sugawara, Yasuhiro

    2009-02-01

    In order to probe dynamical properties of mesoscopic soft matter systems such as polymers, structured liquid, etc., a new atomic force microscopy apparatus with a wide-band magnetic cantilever excitation system was developed. Constant-current driving of an electromagnet up to 1 MHz was implemented with a closed-loop driver circuit. Transfer function of a commercial cantilever attached with a magnetic particle was measured in a frequency range of 1-1000 kHz in distilled water. Effects of the laser spot position, distribution of the force exerted on the cantilever, and difference in the detection scheme on the obtained transfer function are discussed in comparison with theoretical predictions by other research groups. A preliminary result of viscoelasticity spectrum measurement of a single dextran chain is shown and is compared with a recent theoretical calculation.

  16. Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics

    NASA Astrophysics Data System (ADS)

    Kageshima, Masami; Chikamoto, Takuma; Ogawa, Tatsuya; Hirata, Yoshiki; Inoue, Takahito; Naitoh, Yoshitaka; Li, Yan Jun; Sugawara, Yasuhiro

    2009-02-01

    In order to probe dynamical properties of mesoscopic soft matter systems such as polymers, structured liquid, etc., a new atomic force microscopy apparatus with a wide-band magnetic cantilever excitation system was developed. Constant-current driving of an electromagnet up to 1 MHz was implemented with a closed-loop driver circuit. Transfer function of a commercial cantilever attached with a magnetic particle was measured in a frequency range of 1-1000 kHz in distilled water. Effects of the laser spot position, distribution of the force exerted on the cantilever, and difference in the detection scheme on the obtained transfer function are discussed in comparison with theoretical predictions by other research groups. A preliminary result of viscoelasticity spectrum measurement of a single dextran chain is shown and is compared with a recent theoretical calculation.

  17. Compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo Martin; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry Joseph

    2006-08-15

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  18. Nondestructive and noncontact method for determining the spring constant of rectangular cantilevers.

    PubMed

    Golovko, Dmytro S; Haschke, Thomas; Wiechert, Wolfgang; Bonaccurso, Elmar

    2007-04-01

    We present here an experimental setup and suggest an extension to the long existing added-mass method for the calibration of the spring constant of atomic force microscope cantilevers. Instead of measuring the resonance frequency shift that results from attaching particles of known masses to the end of cantilevers, we load them with water microdrops generated by a commercial inkjet dispenser. Such a device is capable of generating drops, and thus masses, of extremely reproducible size. This makes it an ideal tool for calibration tasks. Moreover, the major advantage of water microdrops is that they allow for a nearly contactless calibration: no mechanical micromanipulation of particles on cantilevers is required, neither for their deposition nor for removal. After some seconds the water drop is completely evaporated, and no residues are left on the cantilever surface or tip. We present two variants: we vary the size of the drops and deposit them at the free end of the cantilever, or we keep the size of the drops constant and vary their position along the cantilever. For the second variant, we implemented also numerical simulations. Spring constants measured by this method are comparable to results obtained by the thermal noise method, as we demonstrate for six different cantilevers.

  19. Nondestructive and noncontact method for determining the spring constant of rectangular cantilevers

    SciTech Connect

    Golovko, Dmytro S.; Haschke, Thomas; Wiechert, Wolfgang; Bonaccurso, Elmar

    2007-04-15

    We present here an experimental setup and suggest an extension to the long existing added-mass method for the calibration of the spring constant of atomic force microscope cantilevers. Instead of measuring the resonance frequency shift that results from attaching particles of known masses to the end of cantilevers, we load them with water microdrops generated by a commercial inkjet dispenser. Such a device is capable of generating drops, and thus masses, of extremely reproducible size. This makes it an ideal tool for calibration tasks. Moreover, the major advantage of water microdrops is that they allow for a nearly contactless calibration: no mechanical micromanipulation of particles on cantilevers is required, neither for their deposition nor for removal. After some seconds the water drop is completely evaporated, and no residues are left on the cantilever surface or tip. We present two variants: we vary the size of the drops and deposit them at the free end of the cantilever, or we keep the size of the drops constant and vary their position along the cantilever. For the second variant, we implemented also numerical simulations. Spring constants measured by this method are comparable to results obtained by the thermal noise method, as we demonstrate for six different cantilevers.

  20. Cancelation of thermally induced frequency shifts in bimaterial cantilevers by nonlinear optomechanical interactions

    NASA Astrophysics Data System (ADS)

    Vy, Nguyen Duy; Tri Dat, Le; Iida, Takuya

    2016-08-01

    Bimaterial cantilevers have recently been used in, for example, the calorimetric analysis with picowatt resolution in microscopic space based on state-of-the-art atomic force microscopes. However, thermally induced effects usually change physical properties of the cantilevers, such as the resonance frequency, which reduce the accuracy of the measurements. Here, we propose an approach to circumvent this problem that uses an optical microcavity formed between a metallic layer coated on the back of the cantilever and one coated at the end of an optical fiber irradiating the cantilever. In addition to increasing the sensitivity, the optical rigidity of this system diminishes the thermally induced frequency shift. For a coating thickness of several tens of nanometers, the input power is 5-10 μW. These values can be evaluated from parameters derived by directly irradiating the cantilever in the absence of the microcavity. The system has the potential of using the cantilever both as a thermometer without frequency shifting and as a sensor with nanometer-controlled accuracy.

  1. Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry.

    PubMed

    Gates, Richard S; Pratt, Jon R

    2012-09-21

    Accurate cantilever spring constants are important in atomic force microscopy both in control of sensitive imaging and to provide correct nanomechanical property measurements. Conventional atomic force microscope (AFM) spring constant calibration techniques are usually performed in an AFM. They rely on significant handling and often require touching the cantilever probe tip to a surface to calibrate the optical lever sensitivity of the configuration. This can damage the tip. The thermal calibration technique developed for laser Doppler vibrometry (LDV) can be used to calibrate cantilevers without handling or touching the tip to a surface. Both flexural and torsional spring constants can be measured. Using both Euler-Bernoulli modeling and an SI traceable electrostatic force balance technique as a comparison we demonstrate that the LDV thermal technique is capable of providing rapid calibrations with a combination of ease, accuracy and precision beyond anything previously available.

  2. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.

    PubMed

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell.

  3. A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

    ERIC Educational Resources Information Center

    Jones, C. N.; Goncalves, J.

    2010-01-01

    This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to…

  4. Interaction of the Hydrophobic Tip of an Atomic Force Microscope with Oligopeptides Immobilized Using Short and Long Tethers.

    PubMed

    Ma, C Derek; Acevedo-Vélez, Claribel; Wang, Chenxuan; Gellman, Samuel H; Abbott, Nicholas L

    2016-03-29

    We report an investigation of the adhesive force generated between the hydrophobic tip of an atomic force microscope (AFM) and surfaces presenting oligopeptides immobilized using either short (∼1 nm) or long (∼60 nm) tethers. Specifically, we used either sulfosuccinimidyl-4-(N-maleimidomethyl)cyclohexane-1-carboxylate (SSMCC) or 10 kDa polyethylene glycol (PEG) end-functionalized with maleimide and N-hydroxysuccinimide groups to immobilize helical oligomers of β-amino acids (β-peptides) to mixed monolayers presenting tetraethylene glycol (EG4) and amine-terminated EG4 (EG4N) groups. When SSMCC was used to immobilize the β-peptides, we measured the adhesive interaction between the AFM tip and surface to rupture through a single event with magnitude consistent with the interaction of a single β-peptide with the AFM tip. Surprisingly, this occurred even when, on average, multiple β-peptides were located within the interaction area between the AFM tip and surface. In contrast, when using the long 10 kDa PEG tether, we observed the magnitude of the adhesive interaction as well as the dynamics of the rupture events to unmask the presence of the multiple β-peptides within the interaction area. To provide insight into these observations, we formulated a simple mechanical model of the interaction of the AFM tip with the immobilized β-peptides and used the model to demonstrate that adhesion measurements performed using short tethers (but not long tethers) are dominated by the interaction of single β-peptides because (i) the mechanical properties of the short tether are highly nonlinear, thus causing one β-peptide to dominate the adhesion force at the point of rupture, and (ii) the AFM cantilever is mechanically unstable following the rupture of the adhesive interaction with a single β-peptide. Overall, our study reveals that short tethers offer the basis of an approach that facilitates measurement of adhesive interactions with single molecules presented at

  5. Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope

    SciTech Connect

    Sader, John E.; Yousefi, Morteza; Friend, James R.

    2014-02-15

    Thermal noise spectra of nanomechanical resonators are used widely to characterize their physical properties. These spectra typically exhibit a Lorentzian response, with additional white noise due to extraneous processes. Least-squares fits of these measurements enable extraction of key parameters of the resonator, including its resonant frequency, quality factor, and stiffness. Here, we present general formulas for the uncertainties in these fit parameters due to sampling noise inherent in all thermal noise spectra. Good agreement with Monte Carlo simulation of synthetic data and measurements of an Atomic Force Microscope (AFM) cantilever is demonstrated. These formulas enable robust interpretation of thermal noise spectra measurements commonly performed in the AFM and adaptive control of fitting procedures with specified tolerances.

  6. Structural activity of a cloned potassium channel (ROMK1) monitored with the atomic force microscope: The “molecular-sandwich” technique

    PubMed Central

    Oberleithner, H.; Schneider, S. W.; Henderson, R. M.

    1997-01-01

    The atomic force microscope (AFM) was used to continuously follow height changes of individual protein molecules exposed to physiological stimuli. A AFM tip was coated with ROMK1 (a cloned renal epithelial potassium channel known to be highly pH sensitive) and lowered onto atomically flat mica surface until the protein was sandwiched between AFM tip and mica. Because the AFM tip was an integral part of a highly flexible cantilever, any structural alterations of the sandwiched molecule were transmitted to the cantilever. This resulted in a distortion of the cantilever that was monitored by means of a laser beam. With this system it was possible to resolve vertical height changes in the ROMK1 protein of ≥0.2 nm (approximately 5% of the molecule’s height) with a time resolution of ≥1 msec. When bathed in electrolyte solution that contained the catalytic subunit of protein kinase A and 0.1 mM ATP (conditions that activate the native ion channel), we found stochastically occurring height fluctuations in the ROMK1 molecule. These changes in height were pH-dependent, being greatest at pH 7.6, and lowering the pH (either by titration or by the application of CO2) reduced their magnitude. The data show that overall changes in shape of proteins occur stochastically and increase in size and frequency when the proteins are active. This AFM “molecular-sandwich” technique, called MOST, measures structural activity of proteins in real time and could prove useful for studies on the relationship between structure and function of proteins at the molecular level. PMID:9391167

  7. Shear force control for a terahertz near field microscope.

    PubMed

    Buersgens, F; Acuna, G; Lang, C H; Potrebic, S I; Manus, S; Kersting, R

    2007-11-01

    We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface.

  8. Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile disk optical head.

    PubMed

    Hwu, E-T; Illers, H; Wang, W-M; Hwang, I-S; Jusko, L; Danzebrink, H-U

    2012-01-01

    In this work, an anti-drift and auto-alignment mechanism is applied to an astigmatic detection system (ADS)-based atomic force microscope (AFM) for drift compensation and cantilever alignment. The optical path of the ADS adopts a commercial digital versatile disc (DVD) optical head using the astigmatic focus error signal. The ADS-based astigmatic AFM is lightweight, compact size, low priced, and easy to use. Furthermore, the optical head is capable of measuring sub-atomic displacements of high-frequency AFM probes with a sub-micron laser spot (~570 nm, FWHM) and a high-working bandwidth (80 MHz). Nevertheless, conventional DVD optical heads suffer from signal drift problems. In a previous setup, signal drifts of even thousands of nanometers had been measured. With the anti-drift and auto-alignment mechanism, the signal drift is compensated by actuating a voice coil motor of the DVD optical head. A nearly zero signal drift was achieved. Additional benefits of this mechanism are automatic cantilever alignment and simplified design.

  9. The effects of two-dimensional bifurcations and quantum beats in a system of combined atomic force and scanning tunneling microscopes with quantum dots

    NASA Astrophysics Data System (ADS)

    Zhukovsky, V. Ch.; Krevchik, V. D.; Semenov, M. B.; Krevchik, P. V.; Zaytsev, R. V.; Egorov, I. A.

    2016-11-01

    The field and temperature dependence of the probability of two-dimensional dissipative tunneling is studied in the framework of one-instanton approximation for a model double-well oscillator potential in an external electric field at finite temperature with account for the influence of two local phonon modes for quantum dots in a system of a combined atomic force and a scanning tunneling microscope. It is demonstrated that in the mode of synchronous parallel transfer of tunneling particles from the cantilever tip to the quantum dot the two local phonon modes result in the occurrence of two stable peaks in the curve of the 2D dissipative tunneling probability as a function of the field. Qualitative comparison of the theoretical curve in the limit of weak dissociation and the experimental current-voltage characteristic for quantum dots that grow from colloidal gold under a cantilever tip at the initial stage of quantum-dot formation when the quantum dot size does not exceed 10 nm is performed. It is established that one of the two stable peaks that correspond to interaction of tunneling particles with two local phonon modes in the temperature dependence of the 2D dissipative tunneling probability can be split in two, which corresponds to the tunneling channel interference mechanism. It is found that the theoretically predicted and experimentally observed mode of quantum beats occurs near the bifurcation point.

  10. A study of cantilever-free instrumentation for nanoscale magnetic measurements

    NASA Astrophysics Data System (ADS)

    Altemus, Bruce Adair

    The evolution of the Atomic Force Microscope (AFM) into the Magnetic Force Microscope (MFM) and Magnetic Resonance Force Microscope (MRFM) has had a substantial impact on the characterization of nanoscale phenomena. Detection of 10-17 Newtons per root Hertz has occurred with use of an ultra-sensitive cantilever along with optical interferometry methods within these geometries. The sensitivity of these platforms is dependent on the characteristics of the cantilever, where increased length and a low Young's modulus increase the force sensitivity (meters/newtons). Using IC fabrication techniques, the realization of generating cantilevers with this sensitivity is feasible, but stress compensation layers are required to prevent the free end from curling. Aside from the difficultly in fabrication, the cantilever based approach has one fixed spring constant yielding a finite detectable magnetic force range. An alternative approach incorporating the magnetic levitation of a magnet with an integrated reflector, known as the birdie, has been investigated. The goals of the cantilever-free instrumentation are two fold: (1) To replace the traditional cantilever with a magnetically levitated birdie (which will be scaled down to investigate nanoscale phenomena) through the creation of a virtual cantilever; (2) Investigate the detectable magnetic force range (tunability) of the virtual cantilever. The first 1-D milli-levitation platform has been fabricated and its preliminary characterization has been performed, showing a minimum detectable force in the nano-Newton range with a 10X tunability in spring constant. This high degree of force sensitivity and tunability confirms the design and enables the use for magnetic sample investigation. To further increase the utility of the cantilever-free approach, the birdie has been magnetically levitated in 3D by control circuitry that has been developed and characterized. The magnetic behavior of the custom designed X, Y and Z coil sets

  11. Massively Parallel Atomic Force Microscope with Digital Holographic Readout

    NASA Astrophysics Data System (ADS)

    Sache, L.; Kawakatsu, H.; Emery, Y.; Bleuler, H.

    2007-03-01

    Massively Parallel Scanning Probe Microscopy is an obvious path for data storage (E Grochowski, R F Hoyt, Future Trends in Hard disc Drives, IEEE Trans. Magn. 1996, 32, 1850- 1854; J L Griffin, S W Schlosser, G R Ganger and D F Nagle, Modeling and Performance of MEMS-Based Storage Devices, Proc. ACM SIGMETRICS, 2000). Current experimental systems still lay far behind Hard Disc Drive (HDD) or Digital Video Disk (DVD), be it in access speed, data throughput, storage density or cost per bit. This paper presents an entirely new approach with the promise to break several of these barriers. The key idea is readout of a Scanning Probes Microscope (SPM) array by Digital Holographic Microscopy (DHM). This technology directly gives phase information at each pixel of a CCD array. This means that no contact line to each individual SPM probes is needed. The data is directly available in parallel form. Moreover, the optical setup needs in principle no expensive components, optical (or, to a large extent, mechanical) imperfections being compensated in the signal processing, i.e. in electronics. This gives the system the potential for a low cost device with fast Terabit readout capability.

  12. Note: Aligned deposition and modal characterization of micron and submicron poly(methyl methacyrlate) fiber cantilevers.

    PubMed

    Nain, Amrinder S; Filiz, Sinan; Ozdoganlar, O Burak; Sitti, Metin; Amon, Cristina

    2010-01-01

    Polymeric micro-/nanofibers are finding increasing use as sensors for novel applications. Here, we demonstrate the ability to deposit an array of poly(methyl methacyrlate) fibers with micron and submicron diameters in aligned configurations on customized piezoelectric shakers. Using lateral motion of an atomic force microscope tip, fibers are broken to obtain fiber cantilevers of high aspect ratio (length/diameter > 20). The resonant frequencies of fabricated microfiber cantilevers are experimentally measured using a laser Doppler vibrometer. An average Young's modulus of 3.5 GPa and quality factor of 20 were estimated from the experimentally obtained frequency responses.

  13. High-speed broadband nanomechanical property quantification and imaging of life science materials using atomic force microscope

    NASA Astrophysics Data System (ADS)

    Ren, Juan

    Nanoscale morphological characterization and mechanical properties quantification of soft and biological materials play an important role in areas ranging from nano-composite material synthesis and characterization, cellular mechanics to drug design. Frontier studies in these areas demand the coordination between nanoscale morphological evolution and mechanical behavior variations through simultaneous measurement of these two aspects of properties. Atomic force microscope (AFM) is very promising in achieving such simultaneous measurements at high-speed and broadband owing to its unique capability in applying force stimuli and then, measuring the response at specific locations in a physiologically friendly environment with pico-newton force and nanometer spatial resolution. Challenges, however, arise as current AFM systems are unable to account for the complex and coupled dynamics of the measurement system and probe-sample interaction during high-speed imaging and broadband measurements. In this dissertation, the creation of a set of dynamics and control tools to probe-based high-speed imaging and rapid broadband nanomechanical spectroscopy of soft and biological materials are presented. Firstly, advanced control-based approaches are presented to improve the imaging performance of AFM imaging both in air and in liquid. An adaptive contact mode (ACM) imaging scheme is proposed to replace the traditional contact mode (CM) imaging by addressing the major concerns in both the speed and the force exerted to the sample. In this work, the image distortion caused by the topography tracking error is accounted for in the topography quantification and the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining a stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next

  14. Thermodynamic analysis of liquid bridge for fixed volume in atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wei, Zheng; He, MengFu; Zhao, WenBin; Li, Yang

    2013-10-01

    In ambient condition, capillary forces are the major contributors to the adhesive forces between the tip of an atomic force microscope (AFM) and the sample. In general, capillary forces are thought to be related to water film thickness, contact time and relative humidity and so on. In this paper, an original analysis regarding the liquid bridge, based on the surface and interface thermodynamic theory, is proposed. The cases covered in the study include the capillary forces and temperature of liquid bridge for quickly drawn liquid bridge, and for nonvolatile liquid bridge. The study results show that variation in temperature may occur in the liquid bridge when it is stretched.

  15. Characterization of Akiyama probe applied to dual-probes atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wang, Hequn; Gao, Sitian; Li, Wei; Shi, Yushu; Li, Qi; Li, Shi; Zhu, Zhendong

    2016-10-01

    The measurement of nano-scale line-width has always been important and difficult in the field of nanometer measurements, while the rapid development of integrated circuit greatly raises the demand again. As one kind of scanning probe microscope (SPM), atomic force microscope (AFM) can realize quasi three-dimensional measurement, which is widely used in nanometer scale line-width measurement. Our team researched a dual-probes atomic force microscope, which can eliminate the prevalent effect of probe width on measurement results. In dual-probes AFM system, a novel head are newly designed. A kind of self-sensing and self-exciting probes which is Nanosensors cooperation's patented probe—Akiyama probe, is used in this novel head. The Akiyama probe applied to dual-probe atomic force microscope is one of the most important issues. The characterization of Akiyama probe would affect performance and accuracy of the whole system. The fundamental features of the Akiyama probe are electrically and optically characterized in "approach-withdraw" experiments. Further investigations include the frequency response of an Akiyama probe to small mechanical vibrations externally applied to the tip and the effective loading force yielding between the tip and the sample during the periodic contact. We hope that the characterization of the Akiyama probe described in this paper will guide application for dual-probe atomic force microscope.

  16. LDRD Final Report 01-ERI-001 Probing the Properties of Cells and Cell Surfaces with the Atomic Force Microscope

    SciTech Connect

    McElfresh, M; Belak, J; Rudd, R; Balhorn, R

    2004-02-17

    We have developed new techniques based on atomic force microscopy (AFM) to image, and to quantify the strength of, specific receptor sites on the membrane of a living cell. AFM has developed rapidly during the past decade, providing nanometer scale resolution in the imaging of biological materials ranging in size from single molecules to intact cells. By monitoring the cantilever deflection during approach-retraction cycles (i.e. force-volume curves), the unbinding forces have been determined for various ligand-receptor pairs. It is now possible to use a single receptor molecule bound to the tip of an AFM cantilever to map the locations of ligands bound on solid surfaces, opening the door for new ''recognition mapping'' methods. The goal of our project was to develop recognition mapping for living cells and cell membranes, a major step forward.

  17. Vertically aligned nanostructure scanning probe microscope tips

    DOEpatents

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  18. Theoretical Study of the Effect of Probe Shape on Adhesion Force Between Probe and Substrate in Atomic Force Microscope Experiment

    NASA Astrophysics Data System (ADS)

    Yang, Li; Hu, Junhui; Kong, Lingjiang

    2013-12-01

    The quantitative description of adhesion force dependence on the probe shape is of importance in many scientific and industrial fields. We performed a theoretical study on the influences of the probe shape (the sphere and parabolic probe) on the adhesion force at different humidity in order to elucidate how the adhesion force varied with the probe shape in atomic force microscope manipulation experiment. We found that the combined action of the triple point and the Kelvin radius is the guiding trend of the adhesion force, and these two fundamental parameters are closely related to the probe shape. Meanwhile, the theoretical results demonstrated that the adhesion force are in a good agreement with the experiment data if the van der Waals force is take into account.

  19. Reduced Humidity Effects on Probe Nano-Oxidation Investigated Using Dynamic Force Microscope

    NASA Astrophysics Data System (ADS)

    Kuramochi, Hiromi; Ando, Kazunori; Tokizaki, Takashi; Yokoyama, Hiroshi

    2006-03-01

    Humidity effects on nano-oxidation are investigated using a dynamic force microscope in the humidity range of 30-60%. Oxide size and detected faradaic current increased with relative humidity and applied voltage. The aspect ratios of fabricated oxides at various humidities are approximately of the same magnitude. Scanning probe microscope nano-oxidation in the dynamic mode is less subject to the relative humidity than that in the contact mode.

  20. High-throughput atomic force microscopes operating in parallel

    NASA Astrophysics Data System (ADS)

    Sadeghian, Hamed; Herfst, Rodolf; Dekker, Bert; Winters, Jasper; Bijnagte, Tom; Rijnbeek, Ramon

    2017-03-01

    Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data collection can be an extremely lengthy process in AFM. The use of a single AFM instrument is known for its very low speed and not being suitable for scanning large areas, resulting in a very-low-throughput measurement. We address this challenge by parallelizing AFM instruments. The parallelization is achieved by miniaturizing the AFM instrument and operating many of them simultaneously. This instrument has the advantages that each miniaturized AFM can be operated independently and that the advances in the field of AFM, both in terms of speed and imaging modalities, can be implemented more easily. Moreover, a parallel AFM instrument also allows one to measure several physical parameters simultaneously; while one instrument measures nano-scale topography, another instrument can measure mechanical, electrical, or thermal properties, making it a lab-on-an-instrument. In this paper, a proof of principle of such a parallel AFM instrument has been demonstrated by analyzing the topography of large samples such as semiconductor wafers. This nanoinstrument provides new research opportunities in the nanometrology of wafers and nanolithography masks by enabling real die-to-die and wafer-level measurements and in cell biology by measuring the nano-scale properties of a large number of cells.

  1. Visualization of Cytoskeletal Elements by the Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Berdyyeva, Tamara; Woodworth, Craig; Sokolov, Igor

    2004-03-01

    We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane, soluble proteins, and organelles from the cell. The remaining cytoskeleton can then be directly visualized in either liquid or air-dried ambient conditions. These two types of scanning provide complimentary information. Scanning in liquids visualizes the surface filaments of the cytoskeleton, whereas scanning in air shows both the surface filaments and the total volume of the cytoskeletal fibers. The smallest fibers observed were ca. 50 nm in diameter. The lateral resolution of this technique was ca.20 nm, which can be increased to a single nanometer level by choosing sharper AFM tips. Because the AFM is a true 3 dimensional technique, we are able to quantify the observed cytoskeleton by its density and volume. The types of fibers can be identified by their size, similar to electron microscopy.

  2. Noninvasive determination of optical lever sensitivity in atomic force microscopy

    SciTech Connect

    Higgins, M.J.; Proksch, R.; Sader, J.E.; Polcik, M.; Mc Endoo, S.; Cleveland, J.P.; Jarvis, S.P.

    2006-01-15

    Atomic force microscopes typically require knowledge of the cantilever spring constant and optical lever sensitivity in order to accurately determine the force from the cantilever deflection. In this study, we investigate a technique to calibrate the optical lever sensitivity of rectangular cantilevers that does not require contact to be made with a surface. This noncontact approach utilizes the method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] to calibrate the spring constant of the cantilever in combination with the equipartition theorem [J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993)] to determine the optical lever sensitivity. A comparison is presented between sensitivity values obtained from conventional static mode force curves and those derived using this noncontact approach for a range of different cantilevers in air and liquid. These measurements indicate that the method offers a quick, alternative approach for the calibration of the optical lever sensitivity.

  3. Kinesin force generation measured using a centrifuge microscope sperm-gliding motility assay.

    PubMed Central

    Hall, K; Cole, D; Yeh, Y; Baskin, R J

    1996-01-01

    To measure force generation and characterize the relationship between force and velocity in kinesin-driven motility we have developed a centrifuge microscope sperm-gliding motility assay. The average (extrapolated) value of maximum isometric force at low kinesin density was 0.90 +/- 0.14 pN. Furthermore, in the experiments at low kinesin density, sperm pulled off before stall at forces between 0.40 and 0.75 pN. To further characterize our kinesin-demembranated sperm assay we estimated maximum isometric force using a laser trap-based assay. At low kinesin density, 4.34 +/- 1.5 pN was the maximum force. Using values of axoneme stiffness available from other studies, we concluded that, in our centrifuge microscope-based assay, a sperm axoneme functions as a lever arm, magnifying the centrifugal force and leading to pull-off before stall. In addition, drag of the distal portion of the axoneme is increased by the centrifugal force (because the axoneme is rotated into closer proximity to the glass surface) and represents an additional force that the kinesin motor must overcome. Images FIGURE 1 FIGURE 9 FIGURE 10 PMID:8968616

  4. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

    PubMed

    Hagedorn, Till; El Ouali, Mehdi; Paul, William; Oliver, David; Miyahara, Yoichi; Grütter, Peter

    2011-11-01

    A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10(-10) mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

  5. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

    SciTech Connect

    Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter

    2011-11-15

    A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

  6. Correlation of embryonic skeletal muscle myotube physical characteristics with contractile force generation on an atomic force microscope-based bio-microelectromechanical systems device

    NASA Astrophysics Data System (ADS)

    Pirozzi, K. L.; Long, C. J.; McAleer, C. W.; Smith, A. S. T.; Hickman, J. J.

    2013-08-01

    Rigorous analysis of muscle function in in vitro systems is needed for both acute and chronic biomedical applications. Forces generated by skeletal myotubes on bio-microelectromechanical cantilevers were calculated using a modified version of Stoney's thin-film equation and finite element analysis (FEA), then analyzed for regression to physical parameters. The Stoney's equation results closely matched the more intensive FEA and the force correlated to cross-sectional area (CSA). Normalizing force to measured CSA significantly improved the statistical sensitivity and now allows for close comparison of in vitro data to in vivo measurements for applications in exercise physiology, robotics, and modeling neuromuscular diseases.

  7. Correlation of embryonic skeletal muscle myotube physical characteristics with contractile force generation on an atomic force microscope-based bio-microelectromechanical systems device

    PubMed Central

    Pirozzi, K. L.; Long, C. J.; McAleer, C. W.; Smith, A. S. T.; Hickman, J. J.

    2013-01-01

    Rigorous analysis of muscle function in in vitro systems is needed for both acute and chronic biomedical applications. Forces generated by skeletal myotubes on bio-microelectromechanical cantilevers were calculated using a modified version of Stoney's thin-film equation and finite element analysis (FEA), then analyzed for regression to physical parameters. The Stoney's equation results closely matched the more intensive FEA and the force correlated to cross-sectional area (CSA). Normalizing force to measured CSA significantly improved the statistical sensitivity and now allows for close comparison of in vitro data to in vivo measurements for applications in exercise physiology, robotics, and modeling neuromuscular diseases. PMID:24046483

  8. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.

    PubMed

    Yazdanpanah, Mehdi M; Hosseini, Mahdi; Pabba, Santosh; Berry, Scott M; Dobrokhotov, Vladimir V; Safir, Abdelilah; Keynton, Robert S; Cohn, Robert W

    2008-12-02

    The micro-Wilhelmy method is a well-established method of determining surface tension by measuring the force of withdrawing a tens of microns to millimeters in diameter cylindrical wire or fiber from a liquid. A comparison of insertion force to retraction force can also be used to determine the contact angle with the fiber. Given the limited availability of atomic force microscope (AFM) probes that have long constant diameter tips, force-distance (F-D) curves using probes with standard tapered tips have been difficult to relate to surface tension. In this report, constant diameter metal alloy nanowires (referred to as "nanoneedles") between 7.2 and 67 microm in length and 108 and 1006 nm in diameter were grown on AFM probes. F-D and Q damping AFM measurements of wetting and drag forces made with the probes were compared against standard macroscopic models of these forces on slender cylinders to estimate surface tension, contact angle, meniscus height, evaporation rate, and viscosity. The surface tensions for several low molecular weight liquids that were measured with these probes were between -4.2% and +8.3% of standard reported values. Also, the F-D curves show well-defined stair-step events on insertion and retraction from partial wetting liquids, compared to the continuously growing attractive force of standard tapered AFM probe tips. In the AFM used, the stair-step feature in F-D curves was repeatably monitored for at least 0.5 h (depending on the volatility of the liquid), and this feature was then used to evaluate evaporation rates (as low as 0.30 nm/s) through changes in the surface height of the liquid. A nanoneedle with a step change in diameter at a known distance from its end produced two steps in the F-D curve from which the meniscus height was determined. The step features enable meniscus height to be determined from distance between the steps, as an alternative to calculating the height corresponding to the AFM measured values of surface tension and

  9. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    ERIC Educational Resources Information Center

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-01-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

  10. The Analog Atomic Force Microscope: Measuring, Modeling, and Graphing for Middle School

    ERIC Educational Resources Information Center

    Goss, Valerie; Brandt, Sharon; Lieberman, Marya

    2013-01-01

    using an analog atomic force microscope (A-AFM) made from a cardboard box and mailing tubes. Varying numbers of ping pong balls inside the tubes mimic atoms on a surface. Students use a dowel to make macroscale measurements similar to those of a nanoscale AFM tip as it…

  11. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    SciTech Connect

    Fink, Samuel D.; Fondeur, Fernando F.

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  12. Nano Goes to School: A Teaching Model of the Atomic Force Microscope

    ERIC Educational Resources Information Center

    Planinsic, Gorazd; Kovac, Janez

    2008-01-01

    The paper describes a teaching model of the atomic force microscope (AFM), which proved to be successful in the role of an introduction to nanoscience in high school. The model can demonstrate the two modes of operation of the AFM (contact mode and oscillating mode) as well as some basic principles that limit the resolution of the method. It can…

  13. Intercomparison of lateral scales of scanning electron microscopes and atomic force microscopes in research institutes in Northern Europe

    NASA Astrophysics Data System (ADS)

    Seppä, Jeremias; Korpelainen, Virpi; Bergstrand, Sten; Karlsson, Helge; Lillepea, Lauri; Lassila, Antti

    2014-04-01

    An intercomparison of lateral scales of scanning electron microscopes (SEM) and atomic force microscopes (AFM) in various research laboratories in Northern Europe was organized by the local national metrology institutes. In this paper are presented the results of the comparison, with also an example uncertainty budget for AFM grating pitch measurement. Grating samples (1D) were circulated among the participating laboratories. The participating laboratories were also asked about the calibration of their instruments. The accuracy of the uncertainty estimates seemed to vary largely between the laboratories, and for some laboratories the appropriateness of the calibration procedures could be considered. Several institutes (60% of all results in terms of En value) also had good comprehension of their measurement capability. The average difference from reference value was 6.7 and 10.0 nm for calibrated instruments and 20.6 and 39.9 nm for uncalibrated instruments for 300 nm and 700 nm gratings, respectively. The correlation of the results for both nominally 300 and 700 nm gratings shows that a simple scale factor calibration would have corrected a large part of the deviations from the reference values.

  14. Energy dissipation mechanisms in microcantilever oscillators with applications to the detection of small forces

    NASA Astrophysics Data System (ADS)

    Yasumura, Kevin Youl

    In 1986 the atomic force microscope (AFM) was invented by Binnig, Quate, and Gerber. Cantilever based force microscopy has been used in a wide range of fields including the study of biological samples, data storage media, and microelectronics. These AFM-based imaging techniques typically measure forces in the piconewton (10-12 N) range. Recent developments in microcantilever fabrication and optical fiber displacement sensors have allowed for the construction of force microscope systems that are capable of measuring forces in the attonewton (10-18 N) range. Applications such as magnetic resonance force microscopy (MRFM) require the cantilevers used to have subattonewton force resolution in order to eventually detect single nuclear spins. It is believed that improvements in cantilever and experimental design will allow for improved force resolution. A fundamental limit to the detection of small forces is thermomechanical noise. The thermal noise force limit, via the fluctuation dissipation theorem, is directly related to the amount of mechanical energy dissipation in the cantilever-based force sensor. Work has therefore been focused on developing an understanding of which mechanisms are limiting the force resolution of these microcantilever oscillators. Arrays of silicon nitride, single-crystal silicon, and polysilicon cantilevers have been fabricated and studied. By measuring the dependence of Q on cantilever material, geometry, and surface treatments, significant insight into the dissipation mechanisms has been obtained. For submicron thick cantilevers, Q is found to decrease with decreasing cantilever thickness, indicative of surface loss mechanisms. For single-crystal silicon cantilevers, significant increase in room temperature Q is obtained after 700 C heat treatment in either N 2 or forming gas. Thermoelastic dissipation is not a factor for submicron thick cantilevers, but is shown to be significant for silicon nitride cantilevers as thin as 2.3 um. At low

  15. Microscopic Theory for the Role of Attractive Forces in the Dynamics of Supercooled Liquids.

    PubMed

    Dell, Zachary E; Schweizer, Kenneth S

    2015-11-13

    We formulate a microscopic, no adjustable parameter, theory of activated relaxation in supercooled liquids directly in terms of the repulsive and attractive forces within the framework of pair correlations. Under isochoric conditions, attractive forces can nonperturbatively modify slow dynamics, but at high enough density their influence vanishes. Under isobaric conditions, attractive forces play a minor role. High temperature apparent Arrhenius behavior and density-temperature scaling are predicted. Our results are consistent with recent isochoric simulations and isobaric experiments on a deeply supercooled molecular liquid. The approach can be generalized to treat colloidal gelation and glass melting, and other soft matter slow dynamics problems.

  16. The NanoBeamBalance: A passive, tensile-test device for the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Wenger, M. P. E.; Mesquida, P.

    2011-05-01

    An add-on device is presented, which significantly expands the force measurement capabilities of the atomic force microscope (AFM). The device consists of a completely passive mechanism, which translates the vertical motion of the AFM tip in force measurements into a horizontal motion of two sample support pads. The advantage is that it is much easier to deposit microscopic samples from suspension onto flat surfaces than to attach them reliably between tip and a surface. The working-principle and the design of the device is comprehensively described and demonstrated on the example of collagen fibres with a diameter of a few μm. Well-defined tensile measurements in longitudinal direction were performed, showing that the tensile stiffness of collagen fibres from rat tail tendon decreases by a factor of 5 when rehydrated from a dried sample and slowly increases upon cross-linking with glutaraldehyde.

  17. Geometric derivation of the microscopic stress: A covariant central force decomposition

    NASA Astrophysics Data System (ADS)

    Torres-Sánchez, Alejandro; Vanegas, Juan M.; Arroyo, Marino

    2016-08-01

    We revisit the derivation of the microscopic stress, linking the statistical mechanics of particle systems and continuum mechanics. The starting point in our geometric derivation is the Doyle-Ericksen formula, which states that the Cauchy stress tensor is the derivative of the free-energy with respect to the ambient metric tensor and which follows from a covariance argument. Thus, our approach to define the microscopic stress tensor does not rely on the statement of balance of linear momentum as in the classical Irving-Kirkwood-Noll approach. Nevertheless, the resulting stress tensor satisfies balance of linear and angular momentum. Furthermore, our approach removes the ambiguity in the definition of the microscopic stress in the presence of multibody interactions by naturally suggesting a canonical and physically motivated force decomposition into pairwise terms, a key ingredient in this theory. As a result, our approach provides objective expressions to compute a microscopic stress for a system in equilibrium and for force-fields expanded into multibody interactions of arbitrarily high order. We illustrate the proposed methodology with molecular dynamics simulations of a fibrous protein using a force-field involving up to 5-body interactions.

  18. Measuring the viscoelastic properties of human platelets with the atomic force microscope.

    PubMed Central

    Radmacher, M; Fritz, M; Kacher, C M; Cleveland, J P; Hansma, P K

    1996-01-01

    We have measured force curves as a function of the lateral position on top of human platelets with the atomic force microscope. These force curves show the indentation of the cell as the tip loads the sample. By analyzing these force curves we were able to determine the elastic modulus of the platelet with a lateral resolution of approximately 100 nm. The elastic moduli were in a range of 1-50 kPa measured in the frequency range of 1-50 Hz. Loading forces could be controlled with a resolution of 80 pN and indentations of the platelet could be determined with a resolution of 20 nm. Images FIGURE 1 FIGURE 7 FIGURE 9 FIGURE 11 FIGURE 12 PMID:8770233

  19. Computer Simulation of the Forces Acting on the Polystyrene Probe Submerged into the Succinonitrile Near Phase Transition

    NASA Technical Reports Server (NTRS)

    Bune, Andris V.; Kaukler, William F.; Whitaker, Ann F. (Technical Monitor)

    2001-01-01

    Modeling approach to simulate both mesoscale and microscopic forces acting in a typical AFM experiment is presented. At mesoscale level interaction between the cantilever tip and the sample surface is primarily described by the balance of attractive Van der Waals and repulsive forces. The model of cantilever oscillations is applicable to both non-contact and "tapping" AFM. This model can be farther enhanced to describe nanoparticle manipulation by cantilever. At microscopic level tip contamination and details of tip-surface interaction can be simulated using molecular dynamics approach. Integration of mesoscale model with molecular dynamic model is discussed.

  20. The role of nonlinear dynamics in quantitative atomic force microscopy.

    PubMed

    Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A; Haviland, David B

    2012-07-05

    Various methods of force measurement with the atomic force microscope are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation, or the frequency mixing of multiple drive tones by the nonlinear tip-surface force, can be used to concentrate the nonlinear motion in a narrow band of frequency near the cantilever's fundamental resonance, where accuracy and sensitivity of force measurement are greatest. Two different methods for reconstructing tip-surface forces from intermodulation spectra are explained. The reconstruction of both conservative and dissipative tip-surface interactions from intermodulation spectra are demonstrated on simulated data.

  1. Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy.

    PubMed

    Leiterer, Christian; Deckert-Gaudig, Tanja; Singh, Prabha; Wirth, Janina; Deckert, Volker; Fritzsche, Wolfgang

    2015-05-01

    Tip-enhanced Raman spectroscopy, a combination of Raman spectroscopy and scanning probe microscopy, is a powerful technique to detect the vibrational fingerprint of molecules at the nanometer scale. A metal nanoparticle at the apex of an atomic force microscope tip leads to a large enhancement of the electromagnetic field when illuminated with an appropriate wavelength, resulting in an increased Raman signal. A controlled positioning of individual nanoparticles at the tip would improve the reproducibility of the probes and is quite demanding due to usually serial and labor-intensive approaches. In contrast to commonly used submicron manipulation techniques, dielectrophoresis allows a parallel and scalable production, and provides a novel approach toward reproducible and at the same time affordable tip-enhanced Raman spectroscopy tips. We demonstrate the successful positioning of an individual plasmonic nanoparticle on a commercial atomic force microscope tip by dielectrophoresis followed by experimental proof of the Raman signal enhancing capabilities of such tips.

  2. A low temperature scanning tunneling microscope for electronic and force spectroscopy.

    PubMed

    Smit, R H M; Grande, R; Lasanta, B; Riquelme, J J; Rubio-Bollinger, G; Agraït, N

    2007-11-01

    In this article, we describe and test a novel way to extend a low temperature scanning tunneling microscope with the capability to measure forces. The tuning fork that we use for this is optimized to have a high quality factor and frequency resolution. Moreover, as this technique is fully compatible with the use of bulk tips, it is possible to combine the force measurements with the use of superconductive or magnetic tips, advantageous for electronic spectroscopy. It also allows us to calibrate both the amplitude and the spring constant of the tuning fork easily, in situ and with high precision.

  3. Cantilever clamp fitting

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B. (Inventor)

    1989-01-01

    A device is disclosed for sealing and clamping a cylindrical element which is to be attached to an object such as a wall, a pressurized vessel or another cylindrical element. The device includes a gland having an inner cylindrical wall, which is threaded at one end and is attached at a bendable end to a deformable portion, which in turn is attached to one end of a conical cantilever structure. The other end of the cantilever structure connects at a bendable area to one end of an outer cylindrical wall. The opposite end of cylindrical wall terminates in a thickened portion, the radially outer surface of which is adapted to accommodate a tool for rotating the gland. The terminal end of cylindrical wall also includes an abutment surface, which is adapted to engage a seal, which in turn engages a surface of a receiver. The receiver further includes a threaded portion for engagement with the threaded portion of gland whereby a tightening rotation of gland relative to receiver will cause relative movement between cylindrical walls and of gland. This movement causes a rotation of the conical structure and thus a bending action at bending area and at the bending end of the upper end of inner cylindrical wall. These rotational and bending actions result in a forcing of the deformable portion radially inwardly so as to contact and deform a pipe. This forcible contact creates a seal between gland and pipe, and simultaneously clamps the pipe in position.

  4. Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design

    NASA Astrophysics Data System (ADS)

    Valtiner, Markus; Ankah, Genesis Ngwa; Bashir, Asif; Renner, Frank Uwe

    2011-02-01

    We report the design of an improved electrochemical cell for atomic force microscope measurements in corrosive electrochemical environments. Our design improvements are guided by experimental requirements for studying corrosive reactions such as selective dissolution, dealloying, pitting corrosion, and/or surface and interface forces at electrified interfaces. Our aim is to examine some of the limitations of typical electrochemical scanning probe microscopy (SPM) experiments and in particular to outline precautions and cell-design elements, which must necessarily be taken into account in order to obtain reliable experimental results. In particular, we discuss electrochemical requirements for typical electrochemical SPM experiments and introduce novel design features to avoid common issues such as crevice formations; we discuss the choice of electrodes and contaminations from ions of reference electrodes. We optimize the cell geometry and introduce standard samples for electrochemical AFM experiments. We have tested the novel design by performing force-distance spectroscopy as a function of the applied electrochemical potential between a bare gold electrode surface and a SAM-coated AFM tip. Topography imaging was tested by studying the well-known dealloying process of a Cu3Au(111) surface up to the critical potential. Our design improvements should be equally applicable to in situ electrochemical scanning tunneling microscope cells.

  5. Probing the interaction between air bubble and sphalerite mineral surface using atomic force microscope.

    PubMed

    Xie, Lei; Shi, Chen; Wang, Jingyi; Huang, Jun; Lu, Qiuyi; Liu, Qingxia; Zeng, Hongbo

    2015-03-03

    The interaction between air bubbles and solid surfaces plays important roles in many engineering processes, such as mineral froth flotation. In this work, an atomic force microscope (AFM) bubble probe technique was employed, for the first time, to directly measure the interaction forces between an air bubble and sphalerite mineral surfaces of different hydrophobicity (i.e., sphalerite before/after conditioning treatment) under various hydrodynamic conditions. The direct force measurements demonstrate the critical role of the hydrodynamic force and surface forces in bubble-mineral interaction and attachment, which agree well with the theoretical calculations based on Reynolds lubrication theory and augmented Young-Laplace equation by including the effect of disjoining pressure. The hydrophobic disjoining pressure was found to be stronger for the bubble-water-conditioned sphalerite interaction with a larger hydrophobic decay length, which enables the bubble attachment on conditioned sphalerite at relatively higher bubble approaching velocities than that of unconditioned sphalerite. Increasing the salt concentration (i.e., NaCl, CaCl2) leads to weakened electrical double layer force and thereby facilitates the bubble-mineral attachment, which follows the classical Derjaguin-Landau-Verwey-Overbeek (DLVO) theory by including the effects of hydrophobic interaction. The results provide insights into the basic understanding of the interaction mechanism between bubbles and minerals at nanoscale in froth flotation processes, and the methodology on probing the interaction forces of air bubble and sphalerite surfaces in this work can be extended to many other mineral and particle systems.

  6. Piezoelectric cantilever sensors

    NASA Technical Reports Server (NTRS)

    Shih, Wan Y. (Inventor); Shih, Wei-Heng (Inventor); Shen, Zuyan (Inventor)

    2008-01-01

    A piezoelectric cantilever with a non-piezoelectric, or piezoelectric tip useful as mass and viscosity sensors. The change in the cantilever mass can be accurately quantified by monitoring a resonance frequency shift of the cantilever. For bio-detection, antibodies or other specific receptors of target antigens may be immobilized on the cantilever surface, preferably on the non-piezoelectric tip. For chemical detection, high surface-area selective absorbent materials are coated on the cantilever tip. Binding of the target antigens or analytes to the cantilever surface increases the cantilever mass. Detection of target antigens or analytes is achieved by monitoring the cantilever's resonance frequency and determining the resonance frequency shift that is due to the mass of the adsorbed target antigens on the cantilever surface. The use of a piezoelectric unimorph cantilever allows both electrical actuation and electrical sensing. Incorporating a non-piezoelectric tip (14) enhances the sensitivity of the sensor. In addition, the piezoelectric cantilever can withstand damping in highly viscous liquids and can be used as a viscosity sensor in wide viscosity range.

  7. Microscopic analysis of sharp force trauma in bone and cartilage: a validation study.

    PubMed

    Crowder, Christian; Rainwater, Christopher W; Fridie, Jeannette S

    2013-09-01

    Sharp force trauma research lacks agreement on reported error rates for correctly identifying toolmark characteristics on bone and cartilage. This study provides error rates for determining blade class (serrated, partially serrated, nonserrated) and type of edge bevel (left, right, even). Three analysts examined cuts to a wax medium, cartilage, and bone using two types of microscopes. Additionally, the observers examined impressions taken from the wax medium and the cartilage. Overall, a total of 504 observations were performed. Serrated blades were distinguishable from nonserrated blades due to their patterned striations. Some difficulties were encountered in distinguishing serrated and partially serrated blades; however, when these groups were considered together as one classification type (serrated), classification accuracy improved from 79% to 96%. Classification accuracy for edge bevel was 65%. Error rates were similar when comparing direct observation of the cut marks versus indirect observation (impressions). Additionally, the type of microscope used did not affect error rates.

  8. The relation between a microscopic threshold-force model and macroscopic models of adhesion

    NASA Astrophysics Data System (ADS)

    Hulikal, Srivatsan; Bhattacharya, Kaushik; Lapusta, Nadia

    2017-01-01

    This paper continues our recent work on the relationship between discrete contact interactions at the microscopic scale and continuum contact interactions at the macroscopic scale (Hulikal et al., J. Mech. Phys. Solids 76, 144-161, 2015). The focus of this work is on adhesion. We show that a collection of a large number of discrete elements governed by a threshold-force based model at the microscopic scale collectively gives rise to continuum fracture mechanics at the macroscopic scale. A key step is the introduction of an efficient numerical method that enables the computation of a large number of discrete contacts. Finally, while this work focuses on scaling laws, the methodology introduced in this paper can also be used to study rough-surface adhesion.

  9. Molecular Mechanics of Single Protein Molecules Measured with the Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Hansma, Paul K.

    2000-03-01

    After a short history of AFM development in our lab, including recent developments with small cantilevers, this talk will focus on 1) pulling single protein molecules to explore the forces involved in unfolding and 2) watching single protein molecules in action to learn how they function mechanically. 1) Pulling experiments on proteins used as marine adhesives in abalone shells and other biological composite materials reveal modules bound together by sacrificial bonds that are weaker than the backbone bonds in the polypeptide chain.1 These self-healing modules provide effective energy absorption and appear to be a real key to understanding the impressive fracture resistance of biological composite materials. For example, the abalone shell is 3000 times more fracture resistant than a single crystal of calcium carbonate, despite the fact that 97% of the mass of the shell is crystalline calcium carbonate. 2) It is becoming possible, again with AFMs, to learn how some enzymes, nature's nanomachines, do their exquisite materials synthesis and processing. The talk will focus on the chaperonin system of GroEL and GroES that processes incorrectly folded proteins and assists them in refolding correctly. It is becoming possible not only to see single molecule events such as the association and disassociation of the GroEL-Gro-ES complex, but also to measure potential energy functions for the molecules in various conformational states. These new measurements, together with detailed structural measurements from other techniques, give new clues about how these proteins use the energy of ATP to do their work. Since the AFMs of today are very far from fundamental limits, this is only the beginning. 1. B. L. Smith, T. E. Schaffer, M. Viani, J. B. Thompson, N. A. Frederick, J. Kindt, A. Belcher, G. D. Stucky, D. E. Morse and P. K. Hansma, Nature 399, 761 (1999)

  10. Thermal calibration of photodiode sensitivity for atomic force microscopy

    SciTech Connect

    Attard, Phil; Pettersson, Torbjoern; Rutland, Mark W.

    2006-11-15

    The photodiode sensitivity in the atomic force microscope is calibrated by relating the voltage noise to the thermal fluctuations of the cantilever angle. The method accounts for the ratio of the thermal fluctuations measured in the fundamental vibration mode to the total, and also for the tilt and extended tip of the cantilever. The method is noncontact and is suitable for soft or deformable surfaces where the constant compliance method cannot be used. For hard surfaces, the method can also be used to calibrate the cantilever spring constant.

  11. Minute Current Detection during Anodic Oxidation by Atomic Force Microscope At High Humidity

    NASA Astrophysics Data System (ADS)

    Kuramochi, Hiromi; Ando, Kazunori; Yokoyama, Hiroshi

    2003-09-01

    The faradaic current during anodic oxidation has been detected using an atomic force microscope with intent to study the meniscus formation process and the oxidation mechanism. The faradaic current is of the order of pA for a Si sample, which is at the same level as the leakage current noise; there are problems in detecting, such as sensitivity limits and poor reproducibility. These problems occurred due to high humidity. We could overcome these problems by hermetically sealing the entire electronic parts in the unit to avoid the humidity effects and achieved the detection of a minute current of the sub-pA order even at high humidity.

  12. Velocity controlled anodization nanolithography with an atomic force microscope using Faradaic current feedback

    NASA Astrophysics Data System (ADS)

    Johannes, Matthew S.; Cole, Daniel G.; Clark, Robert L.

    2007-03-01

    A technique, called velocity controlled anodization nanolithography, is presented that ensures line continuity during atomic force microscope based local anodic oxidation on silicon. Spontaneous current spikes disrupt the generation of uniform silicon oxide patterns during lithography at low humidity. Varying the translational speed during lithography in response to the current fluctuations enables the formation of a more complete and continuous oxide layer. The velocity corrections as a result of control are able to maintain constant current flow through the tip-sample interface. The authors demonstrate that this method is effective for in situ quality control.

  13. Atomic Force Microscope Investigations of Bacterial Biofilms Treated with Gas Discharge Plasmas

    NASA Astrophysics Data System (ADS)

    Vandervoort, Kurt; Zelaya, Anna; Brelles-Marino, Graciela

    2012-02-01

    We present investigations of bacterial biofilms before and after treatment with gas discharge plasmas. Gas discharge plasmas represent a way to inactivate bacteria under conditions where conventional disinfection methods are often ineffective. These conditions involve biofilm communities, where bacteria grow embedded in an exopolysaccharide matrix, and cooperative interactions between cells make organisms less susceptible to standard inactivation methods. In this study, biofilms formed by the opportunistic bacterium Pseudomonas aeruginosa were imaged before and after plasma treatment using an atomic force microscope (AFM). Through AFM images and micromechanical measurements we observed bacterial morphological damage and reduced AFM tip-sample surface adhesion following plasma treatment.

  14. Atomic Force Microscope Investigations of Biofilm-Forming Bacterial Cells Treated with Gas Discharge Plasmas

    NASA Astrophysics Data System (ADS)

    Vandervoort, Kurt; Renshaw, Andrew; Abramzon, Nina; Brelles-Marino, Graciela

    2009-03-01

    We present investigations of biofilm-forming bacteria before and after treatment from gas discharge plasmas. Gas discharge plasmas represent a way to inactivate bacteria under conditions where conventional disinfection methods are often ineffective. These conditions involve bacteria in biofilm communities, where cooperative interactions between cells make organisms less susceptible to standard killing methods. Chromobacterium violaceum were imaged before and after plasma treatment using an atomic force microscope (AFM). After 5 min. plasma treatment, 90% of cells were inactivated, that is, transformed to non-culturable cells. Results for cell surface morphology and micromechanical properties for plasma treatments lasting from 5 to 60 minutes were obtained and will be presented.

  15. The role of adhesion in tapping-mode atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Sarid, D.; Hunt, J. P.; Workman, R. K.; Yao, X.; Peterson, C. A.

    The equation of motion of the cantilever of an atomic force microscope (AFM) operating in the tapping mode in the presence of tip-sample adhesion modeled by the JKR theory is solved self-consistently. The vibration of the cantilever is discussed in terms of the parameters characterizing the properties of the cantilever, tip, and sample. A comparison with the experimental phase-shifts as a function of the setpoint reported by Magonov et al. is presented and sample indentation and tip-sample force and pressure are analyzed.

  16. Single-molecule force spectroscopy studies of fibrin 'A-a' polymerization interactions via the atomic force microscope

    NASA Astrophysics Data System (ADS)

    Averett, Laurel E.

    Fibrin, the polymerized form of the soluble plasma protein fibrinogen, plays a critical role in hemostasis as the structural scaffold of blood clots. The primary functions of fibrin are to withstand the shear forces of blood flow and provide mechanical stability to the clot, protecting the wound. While studies have investigated the mechanical properties of fibrin constructs, the response to force of critical polymerization interactions such as the 'A--a' knob--hole interaction remains unclear. Herein, the response of the 'A--a' bond to force was examined at the single-molecule level using the atomic force microscope. Force spectroscopy methodology was developed to examine the 'A--a' interaction while reducing the incidence of both nonspecific and multiple molecule interactions. The rupture of this interaction resulted in a previously unreported characteristic force profile comprised of up to four events. We hypothesized that the first event represented reorientation of the fibrinogen molecule, the second and third represented unfolding of structures in the D region of fibrinogen, and the last event was the rupture of the 'A--a' bond weakened by prior structural unfolding. The configuration, molecular extension, and kinetic parameters of each event in the characteristic pattern were examined to compare the unfolding of fibrin to other proteins unfolded by force. Fitting the pattern with polymer models showed that the D region of fibrinogen could lengthen by ˜50% of the length of a fibrin monomer before rupture of the 'A--a' bond. Analysis showed that the second and third events had kinetic parameters similar to other protein structures unfolded by force. Studies of the dependence of the characteristic pattern on calcium, concentration of sodium chloride, pH, and temperature demonstrated that the incidence of the last event was affected by solution conditions. However, only low pH and high temperatures reduced the probability that an interaction was characteristic

  17. Photothermally excited force modulation microscopy for broadband nanomechanical property measurements

    SciTech Connect

    Wagner, Ryan Killgore, Jason P.

    2015-11-16

    We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric excitation schemes. A complication of PTE FMM is that the sub-resonance cantilever vibration shape is fundamentally different compared to piezoelectric excitation. By directly measuring the vibrational shape of the cantilever, we show that PTE FMM is an accurate nanomechanical characterization method. PTE FMM is a pathway towards the characterization of frequency sensitive specimens such as polymers and biomaterials with frequency range limited only by the resonance frequency of the cantilever and the low frequency limit of the AFM.

  18. Non-contact quantification of laser micro-impulse in water by atomic force microscopy and its application for biomechanics

    NASA Astrophysics Data System (ADS)

    Hosokawa, Yoichiroh

    2011-12-01

    We developed a local force measurement system of a femtosecond laser-induced impulsive force, which is due to shock and stress waves generated by focusing an intense femtosecond laser into water with a highly numerical aperture objective lens. In this system, the force localized in micron-sized region was detected by bending movement of a cantilever of atomic force microscope (AFM). Here we calculated the bending movement of the AFM cantilever when the femtosecond laser is focused in water at the vicinity of the cantilever and the impulsive force is loaded on the cantilever. From the result, a method to estimate the total of the impulsive force at the laser focal point was suggested and applied to estimate intercellular adhesion strength.

  19. Measurements of dispersion forces between colloidal latex particles with the atomic force microscope and comparison with Lifshitz theory

    SciTech Connect

    Elzbieciak-Wodka, Magdalena; Ruiz-Cabello, F. Javier Montes; Trefalt, Gregor; Maroni, Plinio; Borkovec, Michal; Popescu, Mihail N.

    2014-03-14

    Interaction forces between carboxylate colloidal latex particles of about 2 μm in diameter immersed in aqueous solutions of monovalent salts were measured with the colloidal probe technique, which is based on the atomic force microscope. We have systematically varied the ionic strength, the type of salt, and also the surface charge densities of the particles through changes in the solution pH. Based on these measurements, we have accurately measured the dispersion forces acting between the particles and estimated the apparent Hamaker constant to be (2.0 ± 0.5) × 10{sup −21} J at a separation distance of about 10 nm. This value is basically independent of the salt concentration and the type of salt. Good agreement with Lifshitz theory is found when roughness effects are taken into account. The combination of retardation and roughness effects reduces the value of the apparent Hamaker constant and its ionic strength dependence with respect to the case of ideally smooth surfaces.

  20. Measurements of dispersion forces between colloidal latex particles with the atomic force microscope and comparison with Lifshitz theory.

    PubMed

    Elzbieciak-Wodka, Magdalena; Popescu, Mihail N; Montes Ruiz-Cabello, F Javier; Trefalt, Gregor; Maroni, Plinio; Borkovec, Michal

    2014-03-14

    Interaction forces between carboxylate colloidal latex particles of about 2 μm in diameter immersed in aqueous solutions of monovalent salts were measured with the colloidal probe technique, which is based on the atomic force microscope. We have systematically varied the ionic strength, the type of salt, and also the surface charge densities of the particles through changes in the solution pH. Based on these measurements, we have accurately measured the dispersion forces acting between the particles and estimated the apparent Hamaker constant to be (2.0 ± 0.5) × 10(-21) J at a separation distance of about 10 nm. This value is basically independent of the salt concentration and the type of salt. Good agreement with Lifshitz theory is found when roughness effects are taken into account. The combination of retardation and roughness effects reduces the value of the apparent Hamaker constant and its ionic strength dependence with respect to the case of ideally smooth surfaces.

  1. Nanoscale infrared (IR) spectroscopy and imaging of structural lipids in human stratum corneum using an atomic force microscope to directly detect absorbed light from a tunable IR laser source.

    PubMed

    Marcott, Curtis; Lo, Michael; Kjoller, Kevin; Domanov, Yegor; Balooch, Guive; Luengo, Gustavo S

    2013-06-01

    An atomic force microscope (AFM) and a tunable infrared (IR) laser source have been combined in a single instrument (AFM-IR) capable of producing ~200-nm spatial resolution IR spectra and absorption images. This new capability enables IR spectroscopic characterization of human stratum corneum at unprecendented levels. Samples of normal and delipidized stratum corneum were embedded, cross-sectioned and mounted on ZnSe prisms. A pulsed tunable IR laser source produces thermomechanical expansion upon absorption, which is detected through excitation of contact resonance modes in the AFM cantilever. In addition to reducing the total lipid content, the delipidization process damages the stratum corneum morphological structure. The delipidized stratum corneum shows substantially less long-chain CH2 -stretching IR absorption band intensity than normal skin. AFM-IR images that compare absorbances at 2930/cm (lipid) and 3290/cm (keratin) suggest that regions of higher lipid concentration are located at the perimeter of corneocytes in the normal stratum corneum.

  2. Presynaptic structure of Aplysia single live neuron by atomic force and confocal laser scanning microscope.

    PubMed

    Park, Aee-Young; Chae, Yeon-Su; Lee, Seung-Hee; Kaang, Bong-Kiun; Lee, Seonghoon

    2013-05-02

    The structural and functional plasticity of Aplysia mechanosensory presynaptic neurons has been studied in relation with the mechanism underlying learning and memory. Long-term facilitation (LTF), which is a well-known cellular model for long-term memory in Aplysia, is accompanied by new synaptic structural growth or change. We developed a combined atomic force microscope and confocal laser scanning microscope (AFM-CLSM) system integrated with a MATLAB routine for image processing to concurrently obtain high-resolution 3-dimensional (3D) outer-surface morphological images and 3D interior fluorescence images. With our combined AFM-CLSM system, volumetric changes in the presynaptic structures (varicosities) of Aplysia live sensory-motor neuron cocultures were observed. The spatial distribution of synaptic vesicle molecules in the preexisting varicosities was monitored together with a volumetric change in the varicosities. Our combined AFM-CLSM system is successfully adapted for measuring learning-related structural changes and the movement of synaptic molecules in the single live neuron through interaction force and fluorescence imaging.

  3. Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.

    PubMed

    Iwata, F; Ohashi, Y; Ishisaki, I; Picco, L M; Ushiki, T

    2013-10-01

    The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.

  4. Re-calibration of the NIST SRM 2059 master standard using traceable atomic force microscope metrology

    NASA Astrophysics Data System (ADS)

    Dixson, Ronald; Potzick, James; Orji, Ndubuisi G.

    2008-10-01

    The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. An in house optical microscope tool developed at NIST, called the NIST ultra-violet (UV) microscope, was used in transmission mode to calibrate the SRM 2059 photomasks. Due to the limitations of available optical models for determining the edge response in the UV microscope, the tool was used in a comparator mode. One of the masks was selected as a master standard - and the features on this mask were calibrated using traceable critical dimension atomic force microscope (CD-AFM) dimensional metrology. The optical measurements were then used to determine the relative offsets between the widths on the master standard and individual masks for sale to customers. At the time of these measurements, however, the uncertainties in the CD-AFM reference metrology on the master standard were larger than can now be achieved because the NIST single crystal critical dimension reference material (SCCDRM) project had not been completed. Using our CD-AFM at NIST, we have performed new measurements on the SRM 2059 master standard. The new AFM results are in agreement with the prior measurements and have expanded uncertainties approximately one fourth of those of the earlier results for sub-micrometer features. When the optical comparator data for customers masks are reanalyzed using these new AFM results, we expect to reduce the combined reported uncertainties for the linewidths on the actual SRMs by at least 40 % for the nominal 0.25 μm features.

  5. Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

    PubMed Central

    Zhong, Jian; He, Dannong

    2015-01-01

    Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force, and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate, and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future. PMID:26265357

  6. Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

    NASA Astrophysics Data System (ADS)

    Zhong, Jian; He, Dannong

    2015-08-01

    Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force, and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate, and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future.

  7. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy.

    PubMed

    Albers, Boris J; Liebmann, Marcus; Schwendemann, Todd C; Baykara, Mehmet Z; Heyde, Markus; Salmeron, Miquel; Altman, Eric I; Schwarz, Udo D

    2008-03-01

    We present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.

  8. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

    SciTech Connect

    Schwarz, Udo; Albers, Boris J.; Liebmann, Marcus; Schwendemann, Todd C.; Baykara, Mehmet Z.; Heyde, Markus; Salmeron, Miquel; Altman, Eric I.; Schwarz, Udo D.

    2008-02-27

    The authors present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.

  9. Indentation quantification for in-liquid nanomechanical measurement of soft material using an atomic force microscope: Rate-dependent elastic modulus of live cells

    PubMed Central

    Ren, Juan; Yu, Shiyan; Gao, Nan; Zou, Qingze

    2014-01-01

    In this paper, a control-based approach to replace the conventional method to achieve accurate indentation quantification is proposed for nanomechanical measurement of live cells using atomic force microscope. Accurate indentation quantification is central to probe-based nanomechanical property measurement. The conventional method for in-liquid nanomechanical measurement of live cells, however, fails to accurately quantify the indentation as effects of the relative probe acceleration and the hydrodynamic force are not addressed. As a result, significant errors and uncertainties are induced in the nanomechanical properties measured. In this paper, a control-based approach is proposed to account for these adverse effects by tracking the same excitation force profile on both a live cell and a hard reference sample through the use of an advanced control technique, and by quantifying the indentation from the difference of the cantilever base displacement in these two measurements. The proposed control-based approach not only eliminates the relative probe acceleration effect with no need to calibrate the parameters involved, but it also reduces the hydrodynamic force effect significantly when the force load rate becomes high. We further hypothesize that, by using the proposed control-based approach, the rate-dependent elastic modulus of live human epithelial cells under different stress conditions can be reliably quantified to predict the elasticity evolution of cell membranes, and hence can be used to predict cellular behaviors. By implementing the proposed approach, the elastic modulus of HeLa cells before and after the stress process were quantified as the force load rate was changed over three orders of magnitude from 0.1 to 100 Hz, where the amplitude of the applied force and the indentation were at 0.4–2 nN and 250–450 nm, respectively. The measured elastic modulus of HeLa cells showed a clear power-law dependence on the load rate, both before and after the

  10. Getting Physical with Your Chemistry: Mechanically Investigating Local Structure and Properties of Surfaces with the Atomic Force Microscope

    ERIC Educational Resources Information Center

    Heinz, William F.; Hoh, Jan H.

    2005-01-01

    Atomic force microscope (AFM) investigates mechanically the chemical properties of individual molecules, surfaces, and materials using suitably designed probes. The current state of the art of AFM in terms of imaging, force measurement, and sample manipulation and its application to physical chemistry is discussed.

  11. A Weed Cantilever

    ERIC Educational Resources Information Center

    Keller, Elhannan L.; Padalino, John

    1977-01-01

    Describes the Environmental Action Task activity, which may be used as a recreational game or an environmental perception experience, may be conducted indoors or out-of-doors, using weed stems (or spaghetti) and masking tape to construct a cantilever. Small groups of children work together to make the cantilever with the longest arm. Further…

  12. Design of a scanning probe microscope with advanced sample treatment capabilities: An atomic force microscope combined with a miniaturized inductively coupled plasma source.

    PubMed

    Hund, Markus; Herold, Hans

    2007-06-01

    We describe the design and performance of an atomic force microscope (AFM) combined with a miniaturized inductively coupled plasma source working at a radio frequency of 27.12 MHz. State-of-the-art scanning probe microscopes (SPMs) have limited in situ sample treatment capabilities. Aggressive treatments such as plasma etching or harsh treatments such as etching in aggressive liquids typically require the removal of the sample from the microscope. Consequently, time consuming procedures are required if the same sample spot has to be imaged after successive processing steps. We have developed a first prototype of a SPM which features a quasi in situ sample treatment using a modified commercial atomic force microscope. A sample holder is positioned in a special reactor chamber; the AFM tip can be retracted by several millimeters so that the chamber can be closed for a treatment procedure. Most importantly, after the treatment, the tip is moved back to the sample with a lateral drift per process step in the 20 nm regime. The performance of the prototype is characterized by consecutive plasma etching of a nanostructured polymer film.

  13. Self-heating in piezoresistive cantilevers

    PubMed Central

    Doll, Joseph C.; Corbin, Elise A.; King, William P.; Pruitt, Beth L.

    2011-01-01

    We report experiments and models of self-heating in piezoresistive microcantilevers that show how cantilever measurement resolution depends on the thermal properties of the surrounding fluid. The predicted cantilever temperature rise from a finite difference model is compared with detailed temperature measurements on fabricated devices. Increasing the fluid thermal conductivity allows for lower temperature operation for a given power dissipation, leading to lower force and displacement noise. The force noise in air is 76% greater than in water for the same increase in piezoresistor temperature. PMID:21731884

  14. Tunnel junctions, cantilevers, and potentials

    NASA Astrophysics Data System (ADS)

    Tanner, Shawn

    We have developed a process for making sub-micrometer dimensional cantilevers, clamped beams, and more complicate electro-mechanical structures that carry integrated electrical leads. Such objects are perhaps useful as test structures for connecting to and measuring the electrical properties of molecular sized objects, as high frequency electromechanical components for radio and microwave frequency applications, and as sensor components for studying the fluctuation physics of small machines. Our process uses two realigned electron-beam lithography steps, a thin film angled deposition system, and differential removal of sacrificial aluminum layers to produce freely suspended sub-micron electromechanical components. We have produced cantilevers and beams on a variety of substrates (silica, silicon, and poly-imide) and have produced insulating, conductive, and multi-layer mechanical structures. We have measured mechanical resonances in the 10 MHz range by electrostatically actuating the cantilevers while in a magnetic field (3500 gauss) and measuring the voltage that results across the front edge of the cantilever. Two structures are fabricated sharing a common ground so that a balanced detection technique can be used to eliminate background signals. Due to the square dependence of the electrostatic force on the voltage, they can be resonated by a drive voltage of 1/2 the natural frequency or at the natural frequency. Two separate attempts have been made to apply these resonators. First, a process was developed to integrate a tunnel junction with the cantilever. These devices can possibly be used for probing small-scale systems such as molecules. We have verified the exponential variation of the tunneling resistance with both substrate flex and electrostatic gating. Second, a novel gate structure was developed to create a double potential well for resonator motion. This is accomplished by placing a multilayer structure in front of the hairpin cantilever consisting two

  15. Design of mechanical components for vibration reduction in an atomic force microscope.

    PubMed

    Kim, Chulsoo; Jung, Jongkyu; Youm, Woosub; Park, Kyihwan

    2011-03-01

    Vibration is a key factor to be considered when designing the mechanical components of a high precision and high speed atomic force microscope (AFM). It is required to design the mechanical components so that they have resonant frequencies higher than the external and internal vibration frequencies. In this work, the mechanical vibration in a conventional AFM system is analyzed by considering its mechanical components, and a vibration reduction is then achieved by reconfiguring the mechanical components. To analyze the mechanical vibration, a schematic of the lumped model of the AFM system is derived and the vibrational influences of the AFM components are experimentally examined. Based on this vibration analysis, a reconfigured AFM system is proposed and its effects are compared to a conventional system through a series of simulations and experiments.

  16. Scanning thermal microscopy based on a modified atomic force microscope combined with pyroelectric detection

    NASA Astrophysics Data System (ADS)

    Antoniow, J.-S.; Chirtoc, M.; Trannoy, N.; Raphael, O.; Pelzl, J.

    2005-06-01

    We propose a novel approach in scanning thermal microscopy of layered samples. The thermal probe (ThP) (Wollaston wire) acts as a local a.c. heat source at the front of a sample layer deposited on a pyroelectric (PE) sensor. The PE signal is proportional to the heat wave transmitted through the sample. The ThP and PE signals can be used to generate complementary thermal conductivity maps and with some restrictions, thermal diffusivity maps of the sample. Additionally, the topography map is obtained in the usual way from the atomic force microscope. We give the theoretical background for the interpretation of PE signal obtained at low and at high frequency, and we demonstrate that it carries information on the thermal diffusivity of a test sample (12 μm thick PET polymer sheet). Finally, we discuss the contributions of heat transfer channels between ThP and sample, and the role of contact thermal resistance.

  17. Atomic force microscope observation of branching in single transcript molecules derived from human cardiac muscle

    NASA Astrophysics Data System (ADS)

    Reed, Jason; Hsueh, Carlin; Mishra, Bud; Gimzewski, James K.

    2008-09-01

    We have used an atomic force microscope to examine a clinically derived sample of single-molecule gene transcripts, in the form of double-stranded cDNA, (c: complementary) obtained from human cardiac muscle without the use of polymerase chain reaction (PCR) amplification. We observed a log-normal distribution of transcript sizes, with most molecules being in the range of 0.4-7.0 kilobase pairs (kb) or 130-2300 nm in contour length, in accordance with the expected distribution of mRNA (m: messenger) sizes in mammalian cells. We observed novel branching structures not previously known to exist in cDNA, and which could have profound negative effects on traditional analysis of cDNA samples through cloning, PCR and DNA sequencing.

  18. Digital phase-shifting atomic force microscope Moiré method

    NASA Astrophysics Data System (ADS)

    Liu, Chia-Ming; Chen, Lien-Wen

    2005-04-01

    In this study, the digital atomic force microscope (AFM) Moiré method with phase-shifting technology is established to measure the in-plane displacement and strain fields. The Moiré pattern is generated by the interference between the specimen grating and the virtual reference grating formed by digital image processes. The overlapped image is filtered by two-dimensional wavelet transformation to obtain the clear interference Moiré patterns. The four-step phase-shifting method is realized by translating the phase of the virtual reference grating from 0 to 2π. The principle of the digital AFM Moiré method and the phase-shifting technology are described in detail. Experimental results show that this method is convenient to use and efficient in realizing the microscale measurement.

  19. Niobium and niobium nitride SQUIDs based on anodized nanobridges made with an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Faucher, M.; Fournier, T.; Pannetier, B.; Thirion, C.; Wernsdorfer, W.; Villegier, J. C.; Bouchiat, V.

    2002-03-01

    We present a fabrication method of superconducting quantum interference devices (SQUIDs) based on direct write lithography with an atomic force microscope (AFM). This technique involves maskless local anodization of Nb or NbN ultrathin films using the voltage biased tip of the AFM. The SQUIDs are of weak-link type, for which two geometries have been tested: Dayem and variable thickness nanobridges. The magnetic field dependence of the maximum supercurrent Ic( Φ) in resulting SQUIDs is thoroughly measured for different weak link geometries and for both tested materials. It is found that the modulation shape and depth of Ic( Φ) curves are greatly dependent on the weak link size. We analyze the results taking into account the kinetic inductance of nanobridges and using the Likharev-Yakobson model. Finally we show that the present resolution reached by this technique (20 nm) enables us to fabricate Nb weak-links which behavior approaches those of ideal Josephson junctions.

  20. Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope

    SciTech Connect

    Kuwahara, Masashi; Abe, Hidekazu; Tokumoto, Hiroshi; Shima, Takayuki; Tominaga, Junji; Fukuda, Hajime

    2004-03-15

    A carbon nanotube (CNT) was successfully attached to a base probe with a blunt apex and subsequently used as a probe for an atomic force microscope (AFM). This setup demonstrates high spatial resolution properties, plus an advantage: we were able to readily identify the loss of the CNT from the end of the probe by the resultant sudden drop in resolution. This design of probe is expected to feature yet another advantage: that of relative immunity to accidental collision compared to a CNT attached to a commercially available sharp tip. We also discuss the problems specific to CNT-attached probes, which are carbon contamination of the sample surface and artifact images formed at the edge of pit structures. We demonstrate that carbon contamination can be suppressed by a rubbing procedure before the scanning use, and that pit artifacts can be eliminated by optimizing the CNT length.

  1. In-Situ atomic force microscopic observation of ion beam bombarded plant cell envelopes

    NASA Astrophysics Data System (ADS)

    Sangyuenyongpipat, S.; Yu, L. D.; Brown, I. G.; Seprom, C.; Vilaithong, T.

    2007-04-01

    A program in ion beam bioengineering has been established at Chiang Mai University (CMU), Thailand, and ion beam induced transfer of plasmid DNA molecules into bacterial cells (Escherichia coli) has been demonstrated. However, a good understanding of the fundamental physical processes involved is lacking. In parallel work, onion skin cells have been bombarded with Ar+ ions at energy 25 keV and fluence1-2 × 1015 ions/cm2, revealing the formation of microcrater-like structures on the cell wall that could serve as channels for the transfer of large macromolecules into the cell interior. An in-situ atomic force microscope (AFM) system has been designed and installed in the CMU bio-implantation facility as a tool for the observation of these microcraters during ion beam bombardment. Here we describe some of the features of the in-situ AFM and outline some of the related work.

  2. High-throughput automatic defect review for 300mm blank wafers with atomic force microscope

    NASA Astrophysics Data System (ADS)

    Zandiatashbar, Ardavan; Kim, Byong; Yoo, Young-kook; Lee, Keibock; Jo, Ahjin; Lee, Ju Suk; Cho, Sang-Joon; Park, Sang-il

    2015-03-01

    While feature size in lithography process continuously becomes smaller, defect sizes on blank wafers become more comparable to device sizes. Defects with nm-scale characteristic size could be misclassified by automated optical inspection (AOI) and require post-processing for proper classification. Atomic force microscope (AFM) is known to provide high lateral and the highest vertical resolution by mechanical probing among all techniques. However, its low throughput and tip life in addition to the laborious efforts for finding the defects have been the major limitations of this technique. In this paper we introduce automatic defect review (ADR) AFM as a post-inspection metrology tool for defect study and classification for 300 mm blank wafers and to overcome the limitations stated above. The ADR AFM provides high throughput, high resolution, and non-destructive means for obtaining 3D information for nm-scale defect review and classification.

  3. In situ measurements of human articular cartilage stiffness by means of a scanning force microscope

    NASA Astrophysics Data System (ADS)

    Imer, Raphaël; Akiyama, Terunobu; de Rooij, Nico F.; Stolz, Martin; Aebi, Ueli; Kilger, Robert; Friederich, Niklaus F.; Wirz, Dieter; Daniels, A. U.; Staufer, Urs

    2007-03-01

    Osteoarthritis is a painful and disabling progressive joint disease, characterized by degradation of articular cartilage. In order to study this disease at early stages, we have miniaturized and integrated a complete scanning force microscope into a standard arthroscopic device fitting through a standard orthopedic canula. This instrument will allow orthopedic surgeons to measure the mechanical properties of articular cartilage at the nanometer and micrometer scale in-vivo during a standard arthroscopy. An orthopedic surgeon assessed the handling of the instrument. First measurements of the elasticity-modulus of human cartilage were recorded in a cadaver knee non minimal invasive. Second, minimally invasive experiments were performed using arthroscopic instruments. Load-displacement curves were successfully recorded.

  4. Simulation of Tip-Sample Interaction in the Atomic Force Microscope

    NASA Technical Reports Server (NTRS)

    Good, Brian S.; Banerjea, Amitava

    1994-01-01

    Recent simulations of the interaction between planar surfaces and model Atomic Force Microscope (AFM) tips have suggested that there are conditions under which the tip may become unstable and 'avalanche' toward the sample surface. Here we investigate via computer simulation the stability of a variety of model AFM tip configurations with respect to the avalanche transition for a number of fcc metals. We perform Monte-Carlo simulations at room temperature using the Equivalent Crystal Theory (ECT) of Smith and Banerjea. Results are compared with recent experimental results as well as with our earlier work on the avalanche of parallel planar surfaces. Our results on a model single-atom tip are in excellent agreement with recent experiments on tunneling through mechanically-controlled break junctions.

  5. Atomic force microscope characterization of self-assembly behaviors of cyclo[8] pyrrole on solid substrates

    NASA Astrophysics Data System (ADS)

    Xu, Hai; Zhao, Siqi; Xiong, Xiang; Jiang, Jinzhi; Xu, Wei; Zhu, Daoben; Zhang, Yi; Liang, Wenjie; Cai, Jianfeng

    2017-04-01

    Cyclo [8] pyrrole (CP) is a porphyrin analogue containing eight α-conjugated pyrrole units which are arranged in a nearly coplanar conformation. The π-π interactions between CP molecules lead to regular aggregations through a solution casting process. Using tapping mode atomic force microscope (AFM), we investigated the morphology of self-assembled aggregates formed by deposition of different CP solutions on different substrates. We found that in the n-butanol solution, nanofibrous structures could be formed on the silicon or mica surface. Interestingly, on the highly oriented pyrolytic graphite (HOPG) surface, or silicon and mica surface with a toluene solution, only irregular spherical structures were identified. The difference in the nanomorphology may be attributed to distinct interactions between molecule-molecule, molecule-solvent and molecule-substrate.

  6. In situ roughness measurements for the solar cell industry using an atomic force microscope.

    PubMed

    González-Jorge, Higinio; Alvarez-Valado, Victor; Valencia, Jose Luis; Torres, Soledad

    2010-01-01

    Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces. The method is validated by making a comparison between the parameters obtained in this process and in the laboratory under optimal conditions. Areal roughness parameters and Fourier Spectral Analysis of the data show good compatibility and open the possibility to use this type of measurement instrument to perform in situ quality control. This procedure gives a sample for evaluation without destroying any of the transparent conductive oxide; in this way 100% of the production can be tested, so improving the measurement time and rate of production.

  7. Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Yi, Insook; Nishi, Ryuji; Abe, Masayuki; Sugimoto, Yoshiaki; Morita, Seizo

    2011-01-01

    A single atomic defect on an ionic crystal surface was manipulated at the atomic level using an atomic force microscope. During raster scanning, the defect was manipulated at near the tip-sample distance and at room temperature. The defect, which is imaged as a sharp half-moon shape, moves continuously if the tip is close to the sample surface. The defect randomly moves along a zigzag or straight path or jumps long distances. The movement of the defect on an insulator is complex in contrast to that on semiconductors. The defect moves suddenly owing to the tip approaching the surface when the distance feedback is overshot under the condition of a large difference in frequency shift between the feedback set point and a weak interaction on the defect.

  8. Nano-imaging collagen by atomic force, near-field and nonlinear microscope

    NASA Astrophysics Data System (ADS)

    Lim, Ken Choong; Tang, Jinkai; Li, Hao; Ng, Boon Ping; Kok, Shaw Wei; Wang, Qijie; Zhang, Ying

    2015-03-01

    As the most abundant protein in the human body, collagen has a very important role in vast numbers of bio-medical applications. The unique second order nonlinear properties of fibrillar collagen make it a very important index in nonlinear optical imaging based disease diagnosis of the brain, skin, liver, colon, kidney, bone, heart and other organs in the human body. The second-order nonlinear susceptibility of collagen has been explored at the macroscopic level and was explained as a volume-averaged molecular hyperpolarizability. However, details about the origin of optical second harmonic signals from collagen fibrils at the molecular level are still not clear. Such information is necessary for accurate interpolation of bio-information from nonlinear optical imaging techniques. The later has shown great potential in collagen based disease diagnosis methodologies. In this paper, we report our work using an atomic force microscope (AFM), near field (SNOM) and nonlinear laser scanning microscope (NLSM) to study the structure of collagen fibrils and other pro-collagen structures.

  9. The structure of cometary dust - first results from the MIDAS Atomic Force Microscope onboard Rosetta

    NASA Astrophysics Data System (ADS)

    Bentley, M. S.; Torkar, K.; Romstedt, J.

    2014-12-01

    A decade after launch the European Space Agency's Rosetta spacecraft has finally arrived at comet 67P/Churyumov-Gerasimenko. Unlike previous cometary missions, Rosetta is not a flyby, limited to taking a snapshot of the comet at a single heliocentric distance. Instead, Rosetta intercepted the comet prior to the onset of major activity and will chart its evolution during its perihelion passage and beyond. Such a unique mission requires a unique payload; as well as the more typical remote sensing instruments, Rosetta also carries sensors to sample in situ the gas and dust environment. One of these instruments is MIDAS, an atomic force microscope designed to collect dust and image it in three dimensions with nanometre resolution. Equipped with an array of sharp tips, four of which are magnetised to allow magnetic force microscopy, MIDAS exposes targets to the incident flux after which they are moved to the microscope for analysis. As well as extending coverage of the dust size distribution down to the finest particles, MIDAS has the unique capability to determine the shape of pristine particles - to determine, for example, if they are compact or fluffy, and to look for features which may be diagnostic of their formation environment or evolution. The magnetic mode lets MIDAS probe samples for magnetic material and to map its location if present. Having been operating almost continuously after hibernation imaging empty targets before exposure, the first exposures were performed when Rosetta entered 30 km bound orbits. The first MIDAS images and analyses of collected dust grains are presented here.

  10. Calibration of frictional forces in atomic force microscopy

    SciTech Connect

    Ogletree, D.F.; Carpick, R.W.; Salmeron, M.

    1996-09-01

    The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an {ital in} {ital situ} experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. {copyright} {ital 1996 American Institute of Physics.}

  11. Nanomechanical Cantilever Array Sensors

    NASA Astrophysics Data System (ADS)

    Lang, Hans; Hegner, Martin; Gerber, Christoph

    Microfabricated cantilever sensors have attracted much interest in recent years as devices for the fast and reliable detection of small concentrations of molecules in air and solution. In addition to application of such sensors for gas and chemical-vapor sensing, for example as an artificial nose, they have also been employed to measure physical properties of tiny amounts of materials in miniaturized versions of conventional standard techniques such as calorimetry, thermogravimetry, weighing, photothermal spectroscopy, as well as for monitoring chemical reactions such as catalysis on small surfaces. In the past few years, the cantilever-sensor concept has been extended to biochemical applications and as an analytical device for measurements of biomaterials. Because of the label-free detection principle of cantilever sensors, their small size and scalability, this kind of device is advantageous for diagnostic applications and disease monitoring, as well as for genomics or proteomics purposes. The use of microcantilever arrays enables detection of several analytes simultaneously and solves the inherent problem of thermal drift often present when using single microcantilever sensors, as some of the cantilevers can be used as sensor cantilevers for detection, and other cantilevers serve as passivated reference cantilevers that do not exhibit affinity to the molecules to be detected.

  12. Determination of the elastic properties of tomato fruit cells with an atomic force microscope.

    PubMed

    Zdunek, Artur; Kurenda, Andrzej

    2013-09-11

    Since the mechanical properties of single cells together with the intercellular adhesive properties determine the macro-mechanical properties of plants, a method for evaluation of the cell elastic properties is needed to help explanation of the behavior of fruits and vegetables in handling and food processing. For this purpose, indentation of tomato mesocarp cells with an atomic force microscope was used. The Young's modulus of a cell using the Hertz and Sneddon models, and stiffness were calculated from force-indentation curves. Use of two probes of distinct radius of curvature (20 nm and 10,000 nm) showed that the measured elastic properties were significantly affected by tip geometry. The Young's modulus was about 100 kPa ± 35 kPa and 20 kPa ± 14 kPa for the sharper tip and a bead tip, respectively. Moreover, large variability regarding elastic properties (>100%) among cells sampled from the same region in the fruit was observed. We showed that AFM provides the possibility of combining nano-mechanical properties with topography imaging, which could be very useful for the study of structure-related properties of fruits and vegetables at the cellular and sub-cellular scale.

  13. Calibration of an interfacial force microscope for MEMS metrology : FY08-09 activities.

    SciTech Connect

    Houston, Jack E.; Baker, Michael Sean; Crowson, Douglas A.; Mitchell, John Anthony; Moore, Nathan W.

    2009-10-01

    Progress in MEMS fabrication has enabled a wide variety of force and displacement sensing devices to be constructed. One device under intense development at Sandia is a passive shock switch, described elsewhere (Mitchell 2008). A goal of all MEMS devices, including the shock switch, is to achieve a high degree of reliability. This, in turn, requires systematic methods for validating device performance during each iteration of design. Once a design is finalized, suitable tools are needed to provide quality assurance for manufactured devices. To ensure device performance, measurements on these devices must be traceable to NIST standards. In addition, accurate metrology of MEMS components is needed to validate mechanical models that are used to design devices to accelerate development and meet emerging needs. Progress towards a NIST-traceable calibration method is described for a next-generation, 2D Interfacial Force Microscope (IFM) for applications in MEMS metrology and qualification. Discussed are the results of screening several suitable calibration methods and the known sources of uncertainty in each method.

  14. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    NASA Astrophysics Data System (ADS)

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-12-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale—reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use a tactile probe to map the topography or some other property of a sample, the rastering of the probe over the sample is manually controlled, which is both tedious and potentially inaccurate. Other groups have used simulation or tele-operation of an AFM probe. In this paper we describe a teaching AFM with complete computer control to map out topographic and magnetic properties of a "crystal" consisting of two-dimensional arrays of spherical marble "atoms." Our AFM is well suited for lessons on the "Big Ideas of Nanoscale" such as tools and instrumentation, as well as a pre-teaching activity for groups with remote access AFM or mobile AFM. The principle of operation of our classroom AFM is the same as that of a real AFM, excepting the nature of the force between sample and probe.

  15. Indentation with atomic force microscope, Saccharomyces cerevisiae cell gains elasticity under ethanol stress.

    PubMed

    Niu, Yuan-Pu; Lin, Xiang-Hua; Dong, Shi-Jun; Yuan, Qi-Peng; Li, Hao

    2016-10-01

    During bioethanol fermentation process, Saccharomyces cerevisiae cell membrane is the first target to be attacked by the accumulated ethanol. In such a prominent position, S. cerevisiae cell membrane could reversely provide protection through changing fluidity or elasticity secondary to remodeled membrane components or structure during the fermentation process. However, there is yet to be a direct observation of the real effect of the membrane compositional change. In this study, atomic force microscope-based strategy was performed to determine Young's modulus of S. cerevisiae to directly clarify ethanol stress-associated changes and roles of S. cerevisiae cell membrane fluidity and elasticity. Cell survival rate decreased while the cell swelling rate and membrane permeability increased as ethanol concentration increased from 0% to 20% v/v. Young's modulus decreased continuously from 3.76MPa to 1.53MPa while ethanol stress increased from 0% to 20% v/v, indicating that ethanol stress induced the S. cerevisiae membrane fluidity and elasticity changes. Combined with the fact that membrane composition varies under ethanol stress, to some extent, this could be considered as a forced defensive act to the ethanol stress by S. cerevisiae cells. On the other hand, the ethanol stress induced loosening of cell membrane also caused S. cerevisiae cell to proactively remodel membrane to make cell membrane more agreeable to the increase of environmental threat. Increased ethanol stress made S. cerevisiae cell membrane more fluidized and elastic, and eventually further facilitated yeast cell's survival.

  16. Premelting at ice-solid interfaces studied via velocity dependent indentation with force microscope tips.

    NASA Astrophysics Data System (ADS)

    Fain, , Jr.; Pittenger, B.; Cochran, M. J.; Donev, J. M. K.; Robertson, B. E.; Szuchmacher, A. L.; Overney, R. M.

    2000-03-01

    We have indented the surface of ice at temperatures between -1 C and -17 C with sharp atomic force microscope tips. For a thick, viscous interfacial melt layer, a Newtonian treatment of the indentation process suggests that indents at different strain rates should have the same force/velocity ratio for a given pit depth. This is observed for silicon tips with and without a hydrophobic coating at temperatures between -1 C and -10 C implying the presence of a liquid-like layer at the interface between tip and ice. A simple model for viscous flow that incorporates the approximate shape of our tip is used to obtain an estimate of the layer thickness, assuming the layer has the viscosity of supercooled water. This estimate increases with increasing temperature as expected. The hydrophobically coated tip has a significantly thinner layer than the uncoated tip, but the dependence of thickness on temperature is similar. (Supported by NSF DMR 96-23590, U. Washington Nanotechnology Center, and Exxon Educational Foundation.)

  17. DURIP: Piezoresponse Force Microscope (PFM) with Controlled Environment for Characterization of Flexoelectric Nanostructures

    DTIC Science & Technology

    2015-04-21

    under this grant consists of the following units: a Brucker Nano AFM system [9], environment control unit (temperature, gas/liquid, vacuum, and vibration ...flexoelectric characterizations; chamber medium includes gas and liquid; cantilever vibration frequency Hz-MHz. With this PFM, the following new...Sound and Vibration 273, pp.713-740, 2004. [2] B. Kaushik, D. Nance, and K.K. Ahuja, “A Review of the Role of Acoustic Sensors in the Modern

  18. Atomic force microscope manipulation of Ag atom on the Si(111) surface

    NASA Astrophysics Data System (ADS)

    Enkhtaivan, Batnyam; Oshiyama, Atsushi

    2017-01-01

    We present first-principles total-energy electronic-structure calculations that provide the microscopic mechanism of Ag atom diffusion between the half unit cells (HUCs) on the Si(111)-(7 ×7 ) surface with and without the tip of the atomic force microscope (AFM). We find that, without the presence of the AFM tip, there are three pathways of inter-HUC diffusion. The pathway, in which the diffusing atom passes over the nanohole of the surface, has the lowest energy barrier. The diffusion along this pathway between the two HUCs is almost symmetric with the energy barrier of about 0.8 eV in both directions. In the other two pathways, the adatom diffuses along the edge of the nanohole. The diffusion along these two pathways have an energy barrier of about 1 eV. With the presence of the tip, we find that the reaction pathways are essentially the same, but the diffusion along the edge of the nanohole has a lower energy barrier than the diffusion over the nanohole. Thus the diffusion channel is changed by the presence of the tip. In the diffusion along the edge of the nanohole, the energy barrier in one direction is substantially reduced to be 0.2-0.4 eV by the tip, while that of the diffusion in the reverse direction remains larger than 1 eV. The Si tip reduces the energy barrier more than the Pt tip due to the flexibility of the tip apex structure. In addition to the reduction of the barrier, the tip traps the diffusing adatom preventing diffusion in the reverse direction. Also we find that the shape of the tip apex structure is important for the adatom's trapping ability. The bond formation between the AFM tip atom and the surface adatom is essential for atom manipulation using the AFM tip. Our results show that atom manipulation is possible with both the metallic and semiconducting AFM tips.

  19. 3-D Raman Imagery and Atomic Force Microscopy of Ancient Microscopic Fossils

    NASA Astrophysics Data System (ADS)

    Schopf, J.

    2003-12-01

    Investigations of the Precambrian (~540- to ~3,500-Ma-old) fossil record depend critically on identification of authentic microbial fossils. Combined with standard paleontologic studies (e.g., of paleoecologic setting, population structure, cellular morphology, preservational variants), two techniques recently introduced to such studies -- Raman imagery and atomic force microscopy -- can help meet this need. Laser-Raman imagery is a non-intrusive, non-destructive technique that can be used to demonstrate a micron-scale one-to-one correlation between optically discernable morphology and the organic (kerogenous) composition of individual microbial fossils(1,2), a prime indicator of biogencity. Such analyses can be used to characterize the molecular-structural makeup of organic-walled microscopic fossils both in acid-resistant residues and in petrographic thin sections, and whether the fossils analyzed are exposed at the upper surface of, or are embedded within (to depths >65 microns), the section studied. By providing means to map chemically, in three dimensions, whole fossils or parts of such fossils(3), Raman imagery can also show the presence of cell lumina, interior cellular cavities, another prime indicator of biogenicity. Atomic force microscopy (AFM) has been used to visualize the nanometer-scale structure of the kerogenous components of single Precambrian microscopic fossils(4). Capable of analyzing minute fragments of ancient organic matter exposed at the upper surface of thin sections (or of kerogen particles deposited on flat surfaces), such analyses hold promise not only for discriminating between biotic and abiotic micro-objects but for elucidation of the domain size -- and, thus, the degree of graphitization -- of the graphene subunits of the carbonaceous matter analyzed. These techniques -- both new to paleobiology -- can provide useful insight into the biogenicity and geochemical maturity of ancient organic matter. References: (1) Kudryavtsev, A.B. et

  20. Assessment of insulated conductive cantilevers for biology and electrochemistry

    NASA Astrophysics Data System (ADS)

    Frederix, Patrick L. T. M.; Gullo, Maurizio R.; Akiyama, Terunobu; Tonin, Andreas; de Rooij, Nicolaas F.; Staufer, Urs; Engel, Andreas

    2005-08-01

    This paper describes the characterization and application of electrically insulated conductive tips mounted on a cantilever for use in an atomic force microscope and operated in liquid. These multifunctional probes were microfabricated and designed for measurements on biological samples in buffer solution, but they can also be employed for electrochemical applications, in particular scanning electrochemical microscopy. The silicon nitride based cantilevers had a spring constant <=0.1 N m-1 and a conductive tip, which was insulated except at the apex. The conductive core of the tip consisted of a metal, e.g. platinum silicide, and exhibited a typical radius of 15 nm. The mechanical and electrical characterization of the probe is presented and discussed. First measurements on the hexagonally packed intermediate layer of Deinococcus radiodurans demonstrated the possibility to adjust the image contrast by applying a voltage between a support and the conductive tip and to measure variations of less than 1 pA in faradaic current with a lateral resolution of 7.8 nm.

  1. DETAIL OF CANTILEVERED MEZZANINE OBSERVATION ROOM ON SOUTH WEST CORNER ...

    Library of Congress Historic Buildings Survey, Historic Engineering Record, Historic Landscapes Survey

    DETAIL OF CANTILEVERED MEZZANINE OBSERVATION ROOM ON SOUTH- WEST CORNER OF BUILDING. VIEW TO NORTHEAST. - Plattsburgh Air Force Base, Base Engineer Pavement & Grounds Facility, Off Colorado Street, Plattsburgh, Clinton County, NY

  2. Fabrication and measurement of nanostructures on the micro ball surface using a modified atomic force microscope.

    PubMed

    Zhao, X S; Geng, Y Q; Li, W B; Yan, Y D; Hu, Z J; Sun, T; Liang, Y C; Dong, S

    2012-11-01

    In order to machine and measure nanostructures on the micro ball surface, a modified atomic force microscope (AFM) combining a commercial AFM system with a home built precision air bearing spindle is established. Based on this system, motions of both the AFM scanner and the air bearing spindle are controlled to machine nanostructures on the micro ball based on the AFM tip-based nano mechanical machining approach. The eccentric error between the axis of the micro ball and the axis of the spindle is reduced to 3-4 μm by the provided fine adjusting method. A 1000 nano lines array, 36 square pits structure, 10 square pits structure, and a zig-zag structure on the circumference of the micro ball with the diameter of 1.5 mm are machined successfully. The measurement results achieved by the same system reveal that the profiles and mode-power spectra curves of the micro ball are influenced by the artificially machined nanostructures significantly according to their distributions. This work is an useful attempt for modifying the micro ball profile and manufacture of the spherical modulation targets to study the experimental performance of the micro ball in implosion.

  3. Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

    PubMed Central

    Kress, Marina; Wagner, Andreas; Schimmel, Thomas

    2012-01-01

    Summary We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site-selective electrochemical deposition. Here, we demonstrate the reversibility of this process and study the long-term stability of the resulting metallic structures. The remarkable stability for more than 1.5 years under ambient air without any observable changes can be attributed to self-passivation. After AFM-activated electrochemical deposition of copper nanostructures on a polycrystalline gold film and subsequent AFM imaging, the copper nanostructures could be dissolved by reversing the electrochemical potential. Subsequent AFM-tip-activated deposition of different copper nanostructures at the same location where the previous structures were deleted, shows that there is no observable memory effect, i.e., no effect of the previous writing process on the subsequent writing process. Thus, the four processes required for reversible information storage, “write”, “read”, “delete” and “re-write”, were successfully demonstrated on the nanometer scale. PMID:23365795

  4. Fabrication and measurement of nanostructures on the micro ball surface using a modified atomic force microscope

    NASA Astrophysics Data System (ADS)

    Zhao, X. S.; Geng, Y. Q.; Li, W. B.; Yan, Y. D.; Hu, Z. J.; Sun, T.; Liang, Y. C.; Dong, S.

    2012-11-01

    In order to machine and measure nanostructures on the micro ball surface, a modified atomic force microscope (AFM) combining a commercial AFM system with a home built precision air bearing spindle is established. Based on this system, motions of both the AFM scanner and the air bearing spindle are controlled to machine nanostructures on the micro ball based on the AFM tip-based nano mechanical machining approach. The eccentric error between the axis of the micro ball and the axis of the spindle is reduced to 3-4 μm by the provided fine adjusting method. A 1000 nano lines array, 36 square pits structure, 10 square pits structure, and a zig-zag structure on the circumference of the micro ball with the diameter of 1.5 mm are machined successfully. The measurement results achieved by the same system reveal that the profiles and mode-power spectra curves of the micro ball are influenced by the artificially machined nanostructures significantly according to their distributions. This work is an useful attempt for modifying the micro ball profile and manufacture of the spherical modulation targets to study the experimental performance of the micro ball in implosion.

  5. Mechanically Modulated Dewetting by Atomic Force Microscope for Micro- and Nano- Droplet Array Fabrication

    NASA Astrophysics Data System (ADS)

    Wang, Feifei; Li, Pan; Wang, Dong; Li, Longhai; Xie, Shuangxi; Liu, Lianqing; Wang, Yuechao; Li, Wen Jung

    2014-10-01

    Organizing a material into well-defined patterns during the dewetting process provides an attractive micro-/nano-fabrication method without using a conventional lithographic process, and hence, offers potential applications in organic electronics, optics systems, and memory devices. We report here how the mechanical modification of polymer surface by an Atomic Force Microscope (AFM) can be used to guide thin film dewetting evolution and break the intrinsic spatial correlation of spontaneous instability. An AFM is used to implement the mechanical modification of progressively narrow grids to investigate the influence of pattern size on the modulation of ultrathin polystyrene films dewetting evolution. For films with different initial thicknesses, when grid size is close to or below the characteristic wavelength of instability, the spinodal dewetting is suppressed, and film rupture is restricted to the cutting trench. We will show in this paper it is possible to generate only one droplet per gridded area on a thin film subsequent to nucleation dominated dewetting on a non-patterned substrate. Furthermore, when the grid periodicity exceeds the spinodal length, the number of droplets in predefined areas gradually approaches that associated with unconfined dewetting.

  6. Mechanically modulated dewetting by atomic force microscope for micro- and nano- droplet array fabrication.

    PubMed

    Wang, Feifei; Li, Pan; Wang, Dong; Li, Longhai; Xie, Shuangxi; Liu, Lianqing; Wang, Yuechao; Li, Wen Jung

    2014-10-06

    Organizing a material into well-defined patterns during the dewetting process provides an attractive micro-/nano-fabrication method without using a conventional lithographic process, and hence, offers potential applications in organic electronics, optics systems, and memory devices. We report here how the mechanical modification of polymer surface by an Atomic Force Microscope (AFM) can be used to guide thin film dewetting evolution and break the intrinsic spatial correlation of spontaneous instability. An AFM is used to implement the mechanical modification of progressively narrow grids to investigate the influence of pattern size on the modulation of ultrathin polystyrene films dewetting evolution. For films with different initial thicknesses, when grid size is close to or below the characteristic wavelength of instability, the spinodal dewetting is suppressed, and film rupture is restricted to the cutting trench. We will show in this paper it is possible to generate only one droplet per gridded area on a thin film subsequent to nucleation dominated dewetting on a non-patterned substrate. Furthermore, when the grid periodicity exceeds the spinodal length, the number of droplets in predefined areas gradually approaches that associated with unconfined dewetting.

  7. A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer

    NASA Astrophysics Data System (ADS)

    Lee, Dong-Yeon; Kim, Dong-Min; Gweon, Dae-Gab; Park, Jinwon

    2007-02-01

    A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head was developed for use in the nano-metrology field. The x and y position of the sample with respect to the tip are acquired by using the laser interferometer in the open-loop state, when each z data point of the AFM head is taken. The sample scanner, which has a motion amplifying mechanism was designed to move a sample up to 100 μm × 100 μm in orthogonal way, which means less crosstalk between axes. Moreover, the rotational errors between axes are measured to ensure the accuracy of the calibrated AFM within the full scanning range. The conventional homodyne laser interferometer was used to measure the x and y displacements of the sample and compensated via an X-ray interferometer to reduce the nonlinearity of the optical interferometer. The repeatability of the calibrated AFM was measured to sub-nanometers within a few hundred nanometers scanning range.

  8. Nanoimaging and ultra structure of Entamoeba histolytica and its pseudopods by using atomic force microscope

    NASA Astrophysics Data System (ADS)

    Joshi, Narahari V.; Medina, Honorio; Urdaneta, H.; Barboza, J.

    2000-04-01

    Nan-imaging of Entamoeba histolytica was carried out by using Atomic Force Microscope (AFM). The structure of the nucleus, endoplasm and ectoplasm were studied separately. The diameter of the nucleus in living E. histolytica was found to be of the order of 10 micrometers which is slightly higher than the earlier reported value. The presence of karysome was detected in the nucleus. Well-organized patterns of chromatoid bodies located within the endoplasm, were detected and their repetitive patterns were examined. The organized structure was also extended within the ectoplasm. The dimensions and form of the organization suggest that chromatic bodies are constituted with ribosomes ordered in the form of folded sheet. Such structures were found to be absent in non-living E. histolytica. AFM images were also captured just in the act when ameba was extending its pseudopods. Alteration in the ultrastructure caused during the process of extension was viewed. Well marked canals of width 694.05 nm. And height 211.05 nm are clearly perceptible towards the direction of the pseudopods. 3D images are presented to appreciate the height variation, which can not be achieved by conventional well-established techniques such as electron microscopy.

  9. Detection of erythrocytes influenced by aging and type 2 diabetes using atomic force microscope

    SciTech Connect

    Jin, Hua; Xing, Xiaobo; Zhao, Hongxia; Chen, Yong; Huang, Xun; Ma, Shuyuan; Ye, Hongyan; Cai, Jiye

    2010-01-22

    The pathophysiological changes of erythrocytes are detected at the molecular scale, which is important to reveal the onset of diseases. Type 2 diabetes is an age-related metabolic disorder with high prevalence in elderly (or old) people. Up to now, there are no treatments to cure diabetes. Therefore, early detection and the ability to monitor the progression of type 2 diabetes are very important for developing effective therapies. Type 2 diabetes is associated with high blood glucose in the context of insulin resistance and relative insulin deficiency. These abnormalities may disturb the architecture and functions of erythrocytes at molecular scale. In this study, the aging- and diabetes-induced changes in morphological and biomechanical properties of erythrocytes are clearly characterized at nanometer scale using atomic force microscope (AFM). The structural information and mechanical properties of the cell surface membranes of erythrocytes are very important indicators for determining the healthy, diseased or aging status. So, AFM may potentially be developed into a powerful tool in diagnosing diseases.

  10. Atomic force microscope studies on the interactions of Candida rugosa lipase and supported lipidic bilayers.

    PubMed

    Prim, Nuria; Iversen, Lars; Diaz, Pilar; Bjørnholm, Thomas

    2006-10-01

    Using the Langmuir-Blodgett technique we prepared substrate supported well-defined lipid/phospholipid (1-mono-palmitoyl-rac-glycerol (MPG)/l,2-dipalmitoyl-sn-glycerol-3-phosphocholine (DPPC)) bilayers in which the MPG lipid leaflet was exposed to the aqueous phase. Hydrolysis of MPG performed by Candida rugosa lipase (CRL) on the upper MPG layer of these supported bilayers on mica was imaged by real time atomic force microscope (AFM) using a liquid cell, so that the area increase of the initial structural defects could be followed over time. Our data strongly suggest that the edges of the initial structural defects are the preferred activation sites for CRL once the enzyme is adsorbed onto these interfaces. When a 2.5nM bulk concentration of CRL was assayed on this planar lipid substrate, we found a long lag phase before a sharp increase of catalytic activity. The lag-burst kinetic behaviour was related to the interfacial activation phenomenon although we propose that it is also dependent on the gel-phase state of this interface.

  11. Fast, multi-frequency, and quantitative nanomechanical mapping of live cells using the atomic force microscope

    PubMed Central

    Cartagena-Rivera, Alexander X.; Wang, Wen-Horng; Geahlen, Robert L.; Raman, Arvind

    2015-01-01

    A longstanding goal in cellular mechanobiology has been to link dynamic biomolecular processes underpinning disease or morphogenesis to spatio-temporal changes in nanoscale mechanical properties such as viscoelasticity, surface tension, and adhesion. This requires the development of quantitative mechanical microscopy methods with high spatio-temporal resolution within a single cell. The Atomic Force Microscope (AFM) can map the heterogeneous mechanical properties of cells with high spatial resolution, however, the image acquisition time is 1–2 orders of magnitude longer than that required to study dynamic cellular processes. We present a technique that allows commercial AFM systems to map quantitatively the dynamically changing viscoelastic properties of live eukaryotic cells at widely separated frequencies over large areas (several 10’s of microns) with spatial resolution equal to amplitude-modulation (AM-AFM) and with image acquisition times (tens of seconds) approaching those of speckle fluorescence methods. This represents a ~20 fold improvement in nanomechanical imaging throughput compared to AM-AFM and is fully compatible with emerging high speed AFM systems. This method is used to study the spatio-temporal mechanical response of MDA-MB-231 breast carcinoma cells to the inhibition of Syk protein tyrosine kinase giving insight into the signaling pathways by which Syk negatively regulates motility of highly invasive cancer cells. PMID:26118423

  12. The asymmetrical structure of Golgi apparatus membranes revealed by in situ atomic force microscope.

    PubMed

    Xu, Haijiao; Su, Weiheng; Cai, Mingjun; Jiang, Junguang; Zeng, Xianlu; Wang, Hongda

    2013-01-01

    The Golgi apparatus has attracted intense attentions due to its fascinating morphology and vital role as the pivot of cellular secretory pathway since its discovery. However, its complex structure at the molecular level remains elusive due to limited approaches. In this study, the structure of Golgi apparatus, including the Golgi stack, cisternal structure, relevant tubules and vesicles, were directly visualized by high-resolution atomic force microscope. We imaged both sides of Golgi apparatus membranes and revealed that the outer leaflet of Golgi membranes is relatively smooth while the inner membrane leaflet is rough and covered by dense proteins. With the treatment of methyl-β-cyclodextrin and Triton X-100, we confirmed the existence of lipid rafts in Golgi apparatus membrane, which are mostly in the size of 20 nm -200 nm and appear irregular in shape. Our results may be of significance to reveal the structure-function relationship of the Golgi complex and pave the way for visualizing the endomembrane system in mammalian cells at the molecular level.

  13. Mapping thermal conductivity using bimetallic atomic force microscopy probes

    NASA Astrophysics Data System (ADS)

    Grover, Ranjan; McCarthy, Brendan; Sarid, Dror; Guven, Ibrahim

    2006-06-01

    We demonstrate a technique to measure local thermal conductivity of materials using an atomic force microscope equipped with a commercial silicon cantilever coated by a thin metal film. This bimaterial cantilever acts as a bimetallic strip that bends when heated by a focused laser beam. The bending is apparent as a topographic distortion, which varies with the amount of heat flowing from the cantilever's tip into the sample. By comparing the surface topographies of the sample, as measured with heated and unheated cantilevers, the local thermal conductivity of the tip-sample contact area can be determined. Experimental results with this system are presented and found to be in good agreement with a finite element model.

  14. Serial weighting of micro-objects with resonant microchanneled cantilevers

    NASA Astrophysics Data System (ADS)

    Ossola, Dario; Dörig, Pablo; Vörös, János; Zambelli, Tomaso; Vassalli, Massimo

    2016-10-01

    Atomic force microscopy (AFM) cantilevers have proven to be very effective mass sensors. The attachment of a small mass to a vibrating cantilever produces a resonance frequency shift that can be monitored, providing the ability to measure mass changes down to a few molecules resolution. Nevertheless, the lack of a practical method to handle the catch and release process required for dynamic weighting of microobjects strongly hindered the application of the technology beyond proof of concept measurements. Here, a method is proposed in which FluidFM hollow cantilevers are exploited to overcome the standard limitations of AFM-based mass sensors, providing high throughput single object weighting with picogram accuracy. The extension of the dynamic models of AFM cantilevers to hollow cantilevers was discussed and the effectiveness of mass weighting in air was validated on test samples.

  15. X-ray holographic microscopy using the atomic-force microscope

    SciTech Connect

    Howells, M.R.; Jacobsen, C.J.; Lindaas, S.

    1993-09-01

    The present authors have been seeking for some time to improve the resolution of holographic microscopy and have engaged in a continuing series of experiments using the X1A soft x-ray undulator beam line at Brookhaven. The principle strategy for pushing the resolution lower in these experiments has been the use of polymer resists as x-ray detectors and the primary goal has been to develop the technique to become useful for examining wet biological material. In the present paper the authors report on progress in the use of resist for high-spatial-resolution x-ray detection. This is the key step in in-line holography and the one which sets the ultimate limit to the image resolution. The actual recording has always been quite easy, given a high-brightness undulator source, but the difficult step was the readout of the recorded pattern. The authors describe in what follows how they have built a special instrument: an atomic force microscope (AFM) to read holograms recorded in resist. They report the technical reasons for building, rather than buying, such an instrument and they give details of the design and performance of the device. The authors also describe the first attempts to use the system for real holography and the authors show results of both recorded holograms and the corresponding reconstructed images. Finally, the authors try to analyze the effect that these advances are likely to have on the future prospects for success in applications of x-ray holography and the degree to which the other technical systems that are needed for such success are available or within reach.

  16. Physical bounds of metallic nanofingers obtained by mechano-chemical atomic force microscope nanolithography

    NASA Astrophysics Data System (ADS)

    Akhavan, O.; Abdolahad, M.

    2009-01-01

    To obtain metallic nanofingers applicable in surface acoustic wave (SAW) sensors, a mechano-chemical atomic force microscope (AFM) nanolithography on a metallic thin film (50 nm in thickness)/piezoelectric substrate covered by a spin-coated polymeric mask layer (50-60 nm in thickness) was implemented. The effective shape of cross-section of the before and after etching grooves have been determined by using the AFM tip deconvolution surface analysis, structure factor, and power spectral density analyses. The wet-etching process improved the shape and aspect ratio (height/width) of the grooves and also smoothed the surface within them. We have shown that the relaxed surface tension of the polymeric mask layer resulted in a down limitation in width and length of the lithographed nanofingers. The surface tension of the mask layer can be changed by altering the initial concentration of the polymer in the deposition process. As the surface tension reduced, the down limitation decreased. In fact, an extrapolation of the analyzed statistical data has indicated that by decreasing the surface tension from 39 to 10 nN/nm, the minimum obtainable width and length of the metallic nanofingers was changed from about 55 nm and 2 μm to 15 nm and 0.44 μm, respectively. Using the extrapolation's results, we have shown that the future SAW sensors buildable by this nanolithography method possess a practical bound in their synchronous frequency (˜58 GHz), mass sensitivity (˜6125 MHz-mm 2/ng), and the limit of mass resolution (˜4.88 × 10 -10 ng/mm 2).

  17. An analysis of magnetization patterns measured using a magnetic force scanning tunneling microscope (abstract)

    NASA Astrophysics Data System (ADS)

    Burke, E. R.; Gomez, R. D.; Mayergoyz, I. D.

    1994-05-01

    In a previous paper, we made a complete analysis of the interaction between the probe tip of a magnetic force scanning tunneling microscope (MFSTM) and the magnetic fields emanating from a typical recorded pattern. In this paper we show how the magnetization distribution in the recorded media can be determined from the measurements by obtaining expressions for the magnetic fields from a Fourier series expansion for the recorded magnetizations. We have used these techniques to find the magnetic fields from many different distributions, including all those we could find in the literature. The probe tip displacement, which is the quantity measured using the MFSTM, can be calculated using these magnetic fields. The results can then be compared to the experimental data. For one set of experiments on high density recording we have found that the best fit is with a magnetization that has a modified arctan transition. The modification eliminates the discontinuity in the slope of the transitions as they are joined together, giving a more realistic representation of the magnetic distribution. The transition width can then be used as an adjustable parameter to find the best fit to the data. The MFSTM can, therefore, be used as a quantitative tool to find the magnetic recording transition widths. These theoretical techniques are not necessarily restricted to the use of a MFSTM, but can be applied to other problems in magnetic recording. For instance, we show how the probe tip displacement corresponds to the flux picked up by a conventional read head. The response of the head as a function of different magnetization patterns can then be studied and compared to experimental results. The measurable quantities are expressed in Fourier series but we show how these series can be easily evaluated with a PC and the appropriate software.

  18. Three-dimensional force microscope: A nanometric optical tracking and magnetic manipulation system for the biomedical sciences

    NASA Astrophysics Data System (ADS)

    Fisher, J. K.; Cummings, J. R.; Desai, K. V.; Vicci, L.; Wilde, B.; Keller, K.; Weigle, C.; Bishop, G.; Taylor, R. M.; Davis, C. W.; Boucher, R. C.; O'Brien, E. Timothy; Superfine, R.

    2005-05-01

    We report here the development of a three-dimensional (3D) magnetic force microscope for applying forces to and measuring responses of biological systems and materials. This instrument combines a conventional optical microscope with a free-floating or specifically bound magnetic bead used as a mechanical probe. Forces can be applied by the bead to microscopic structures of interest (specimens), while the reaction displacement of the bead is measured. This enables 3D mechanical manipulations and measurements to be performed on specimens in fluids. Force is generated by the magnetically permeable bead in reaction to fields produced by external electromagnets. The displacement is measured by interferometry using forward light scattered by the bead from a focused laser beam. The far-field interference pattern is imaged on a quadrant photodetector from which the 3D displacement can be computed over a limited range about the focal point. The bead and specimen are mounted on a 3D translation stage and feedback techniques are used to keep the bead within this limited range. We demonstrate the system with application to beads attached to cilia in human lung cell cultures.

  19. Interpreting atomic force microscopy measurements of hydrodynamic and surface forces with nonlinear parametric estimation.

    PubMed

    Cui, Song; Manica, Rogerio; Tabor, Rico F; Chan, Derek Y C

    2012-10-01

    A nonlinear parameter estimation method has been developed to extract the separation-dependent surface force and cantilever spring constant from atomic force microscope data taken at different speeds for the interaction between a silica colloidal probe and plate in aqueous solution. The distinguishing feature of this approach is that it exploits information from the velocity dependence of the force-displacement data due to hydrodynamic interaction to provide an unbiased estimate of the functional form of the separation-dependent surface force. An assumed function for the surface force with unknown parameters is not required. In addition, the analysis also yields a consistent estimate of the in situ cantilever spring constant. In combination with data from static force measurements, this approach can further be used to quantify the extent of hydrodynamic slip.

  20. Noncontact method for calibration of lateral forces in scanning force microscopy.

    PubMed

    Wagner, Kyle; Cheng, Peng; Vezenov, Dmitri

    2011-04-19

    This paper describes a noncontact calibration procedure for lateral force microscopy in air and liquids. The procedure is based on the observation that the sensitivity of a force microscope may be calibrated using the raw thermal noise spectrum of the cantilever and its known spring constant, which can be found from the same uncalibrated thermal noise spectrum using Sader's method (Rev. Sci. Instrum.1999, 70, 3967-3969). In addition to the power spectrum of the cantilever thermal noise, this noncontact calibration method only requires knowledge of the plan view dimensions of the cantilever that could be measured using an optical microscope. This method is suitable for in situ force calibration even in viscous fluids through a two-step calibration procedure, where the cantilever thermal spectra are captured both in air and in the desired liquid. The lateral calibration performed with the thermal noise technique agrees well with sensitivity values obtained by the wedge calibration procedure. The approach examined in this paper allows for complete calibration of normal and lateral forces without contacting the surface, eliminating the possibility for any tip damage or contamination during calibration.

  1. Laser beam scanning microscope and piezoresponse force microscope studies on domain structured in 001-, 110-, and 111-oriented NaNbO3 films

    NASA Astrophysics Data System (ADS)

    Yamazoe, Seiji; Kohori, Akihiro; Sakurai, Hiroyuki; Kitanaka, Yuuki; Noguchi, Yuji; Miyayama, Masaru; Wada, Takahiro

    2012-09-01

    NaNbO3 (NN) films were epitaxially grown on SrRuO3/(001), (110), and (111)SrTiO3 substrates, and these NN films were characterized by a laser beam scanning microscope and a piezoresponse force microscope. The 001-oriented NN film had antiferroelectric 90° domains with 100 and 010 polarization axes and 90° domain walls exhibiting piezoresponse. The piezoresponding domain walls would be induced by ferroelasticity. On the other hand, the 110- and 111-oriented NN films possessed 60° domains. The 60° domains of 110-oriented NN film were constructed by antiferroelectric 11¯0 domain and piezoresponding {101} and {011} domains. In the case of 111-oriented NN, three kinds of 60° domains (11¯0 and 01¯1, 01¯1 and 101¯, and 101¯ and 11¯0) were observed. The fine domains with piezoresponse were also observed in the mixed region with the three 60° domains. From the stress measurement, we found that the difference in the domain structure of 001-, 110-, and 111-oriented NN films depends not only on the orientation direction but also on the stress from the substrate. Moreover, the stress and the induction of the piezoelectric domain also influence the dielectric behavior.

  2. Method for providing a compliant cantilevered micromold

    DOEpatents

    Morales, Alfredo M.; Domeier, Linda A.; Gonzales, Marcela G.; Keifer, Patrick N.; Garino, Terry J.

    2008-12-16

    A compliant cantilevered three-dimensional micromold is provided. The compliant cantilevered micromold is suitable for use in the replication of cantilevered microparts and greatly simplifies the replication of such cantilevered parts. The compliant cantilevered micromold may be used to fabricate microparts using casting or electroforming techniques. When the compliant micromold is used to fabricate electroformed cantilevered parts, the micromold will also comprise an electrically conducting base formed by a porous metal substrate that is embedded within the compliant cantilevered micromold. Methods for fabricating the compliant cantilevered micromold as well as methods of replicating cantilevered microparts using the compliant cantilevered micromold are also provided.

  3. Mapping and control of atomic force on Si(1 1 1)square root(3) x square root(3)-Ag surface using noncontact atomic force microscope.

    PubMed

    Morita, S; Sugawara, Y

    2002-05-01

    We demonstrated the possibility of measuring the three-dimensional force-related map with true atomic resolution between an Si tip and Si(1 1 1)square root(3) x square root(3)-Ag sample surface by measuring the tip-sample distance dependence of noncontact atomic force microscope (NC-AFM) image, i.e. atomically resolved atomic force spectroscopy. Furthermore, we demonstrated the possibility of controlling the interaction force between the atom on the tip apex and a sample atom of Si(1 1 1)square root(3) x square root(3)-Ag surface on an atomic scale by placing an Ag atom on the Si tip apex instead of Si atom.

  4. Characterization of magnetically actuated resonant cantilevers in viscous fluids

    NASA Astrophysics Data System (ADS)

    Vančura, Cyril; Lichtenberg, Jan; Hierlemann, Andreas; Josse, Fabien

    2005-10-01

    The vibration behavior of magnetically actuated resonant microcantilevers immersed in viscous fluids has been studied. A dependence of the resonance frequency and the quality factor (Q factor) on the fluid properties, such as density and viscosity and on the cantilever geometry is described. Various cantilever geometries are analyzed in pure water and glycerol solutions, and the results are explained in terms of the added displaced fluid mass and the fluid damping force for both the resonance frequency and the quality factor. An in-depth knowledge and understanding of such systems is necessary when analyzing resonant cantilevers as biochemical sensors in liquid environments.

  5. Cantilever arrays with self-aligned nanotips of uniform height

    NASA Astrophysics Data System (ADS)

    Koelmans, W. W.; Peters, T.; Berenschot, E.; de Boer, M. J.; Siekman, M. H.; Abelmann, L.

    2012-04-01

    Cantilever arrays are employed to increase the throughput of imaging and manipulation at the nanoscale. We present a fabrication process to construct cantilever arrays with nanotips that show a uniform tip-sample distance. Such uniformity is crucial, because in many applications the cantilevers do not feature individual tip-sample spacing control. Uniform cantilever arrays lead to very similar tip-sample interaction within an array, enable non-contact modes for arrays and give better control over the load force in contact modes. The developed process flow uses a single mask to define both tips and cantilevers. An additional mask is required for the back side etch. The tips are self-aligned in the convex corner at the free end of each cantilever. Although we use standard optical contact lithography, we show that the convex corner can be sharpened to a nanometre scale radius by an isotropic underetch step. The process is robust and wafer-scale. The resonance frequencies of the cantilevers within an array are shown to be highly uniform with a relative standard error of 0.26% or lower. The tip-sample distance within an array of up to ten cantilevers is measured to have a standard error around 10 nm. An imaging demonstration using the AFM shows that all cantilevers in the array have a sharp tip with a radius below 10 nm. The process flow for the cantilever arrays finds application in probe-based nanolithography, probe-based data storage, nanomanufacturing and parallel scanning probe microscopy.

  6. Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

    PubMed Central

    Glatzel, Thilo; Schmölzer, Thomas; Schöner, Adolf; Reshanov, Sergey; Bartolf, Holger; Meyer, Ernst

    2015-01-01

    Summary Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices. However, the characterization of conducting or semiconducting power devices with EFM methods requires an accurate and reliable technique from the nanometre up to the micrometre scale. For high force sensitivity it is indispensable to operate the microscope under high to ultra-high vacuum (UHV) conditions to suppress viscous damping of the sensor. Furthermore, UHV environment allows for the analysis of clean surfaces under controlled environmental conditions. Because of these requirements we built a large area scanning probe microscope operating under UHV conditions at room temperature allowing to perform various electrical measurements, such as Kelvin probe force microscopy, scanning capacitance force microscopy, scanning spreading resistance microscopy, and also electrostatic force microscopy at higher harmonics. The instrument incorporates beside a standard beam deflection detection system a closed loop scanner with a scan range of 100 μm in lateral and 25 μm in vertical direction as well as an additional fibre optics. This enables the illumination of the tip–sample interface for optically excited measurements such as local surface photo voltage detection. Results: We present Kelvin probe force microscopy (KPFM) measurements before and after sputtering of a copper alloy with chromium grains used as electrical contact surface in ultra-high power switches. In addition, we discuss KPFM measurements on cross sections of cleaved silicon carbide structures: a calibration layer sample and a power rectifier. To demonstrate the benefit of surface photo voltage measurements, we analysed the contact potential difference of a silicon carbide p/n-junction under illumination. PMID:26885461

  7. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope.

    PubMed

    Lange, Manfred; van Vörden, Dennis; Möller, Rolf

    2012-01-01

    Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip-sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111) √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force-distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle.

  8. Calibration of higher eigenmodes of cantilevers

    NASA Astrophysics Data System (ADS)

    Labuda, Aleksander; Kocun, Marta; Lysy, Martin; Walsh, Tim; Meinhold, Jieh; Proksch, Tania; Meinhold, Waiman; Anderson, Caleb; Proksch, Roger

    2016-07-01

    A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonant frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for several cantilever models. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

  9. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

    PubMed Central

    van Vörden, Dennis; Möller, Rolf

    2012-01-01

    Summary Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip–sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111) √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force–distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle. PMID:22496993

  10. Thermal Noise Reduction of Mechanical Oscillators by Actively Controlled External Dissipative Forces

    NASA Technical Reports Server (NTRS)

    Liang, Shoudan; Medich, David; Czajkowsky, Daniel M.; Sheng, Sitong; Yuan, Jian-Yang; Shao, Zhifeng

    1999-01-01

    We show that the thermal fluctuations of very soft mechanical oscillators, such as the cantilever in an atomic force microscope (AFM), can be reduced without changing the stiffness of the spring or having to lower the environment temperature. We derive a theoretical relationship between the thermal fluctuations of an oscillator and an actively external-dissipative force. This relationship is verified by experiments with an AFM cantilever where the external active force is coupled through a magnetic field. With simple instrumentation, we have reduced the thermal noise amplitude of the cantilever by a factor of 3.4, achieving an apparent temperature of 25 K with the environment at 295K. This active noise reduction approach can significantly improve the accuracy of static position or static force measurements in a number of practical applications.

  11. System analysis of force feedback microscopy

    SciTech Connect

    Rodrigues, Mario S.; Chevrier, Joël; Comin, Fabio

    2014-02-07

    It was shown recently that the Force Feedback Microscope (FFM) can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects of the associated real time control of the tip position. We take into account lever parameters such as the lever characteristics in its environment, spring constant, mass, dissipation coefficient, and the operating conditions such as controller gains and interaction force. We show how the controller parameters are determined so that the FFM functions at its best and estimate the bandwidth of the system under these conditions.

  12. Surface roughtness and its influence on particle adhesion using atomic force microscope techniques

    SciTech Connect

    Gady, B.; Schaefer, D.; Reifenberger, R.; Rimai, D.; DeMejo, L.P.

    1996-12-31

    The surface force interactions between individual 8 {mu}m diameter spheres and atomically flat substrates have been systematically investigated using atomic force techniques. The lift-off force of glass, polystyrene and tin particles from atomically smooth mica and highly oriented pyrolytic graphite substrates was determined as a function of the applied loading force in an inert nitrogen environment. While the relative magnitudes of the measured lift-off force was found to scale as expected between the various systems studied, the absolute values were a factor of {approximately}50 smaller than expected from the Johnson, Kendall, and Roberts theory. The surface topography of representative spheres was characterized with atomic force microscopy, allowing a quantitative assessment of the role that surface roughness plays in the adhesion of micrometer-size particles to substrates. Taking into account the radius of curvature of the asperities measured from the atomic force scans, agreement between the measured and theoretical estimates for the lift-off forces was improved, with the corrected experimental forces about a factor of 3 smaller than theoretical expectations.

  13. The role of the "Casimir force analogue" at the microscopic processes of crystallization and melting

    NASA Astrophysics Data System (ADS)

    Chuvildeev, V. N.; Semenycheva, A. V.

    2016-10-01

    Melting (crystallization), a phase transition from a crystalline solid to a liquid state, is a common phenomenon in nature. We suggest a new factor, "the Casimir force analogue", to describe mechanisms of melting and crystallization. The Casimir force analogue is a force occurring between the surfaces of solid and liquid phases of metals caused by different energy density of phonons of these phases. It explains abrupt changes in geometry and thermodynamic parameters at a melting point. "The Casimir force analogue" helps to estimate latent melting heat and to gain an insight into a solid-liquid transition problem.

  14. Tribological behavior of a charged atomic force microscope tip on graphene oxide films.

    PubMed

    Jiang, Yan; Li, Yang; Liang, Bing; Yang, Xiaofei; Han, Tongwei; Wang, Ze

    2012-12-14

    The tribological behavior of graphene oxide (GO) films deposited on a mica substrate has been investigated by atomic force microscopy, in which different voltages were applied to a tip. It was found that the frictional forces on the GO films remain unchanged in the presence of negative tip voltages, while the frictional forces increase remarkably with an increase of the voltage when positive voltages are given to the tip, and at a certain positive tip voltage the frictional forces reach a stable value with increasing number of repeated cycles. To study the influence of the tip voltage on the frictional forces of the GO films, the adhesive and electrostatic force gradients between the tip and GO films were measured. The results showed that the adhesive and electrostatic forces increased with increase of the positive tip voltages. This phenomenon is due to the polarization of charges in the GO films induced by the applied tip voltages, which causes intensive electrostatic interactions between the tip and GO films and a corresponding rise in the adhesive forces and the frictional forces.

  15. Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization.

    PubMed

    Lanza, M; Bayerl, A; Gao, T; Porti, M; Nafria, M; Jing, G Y; Zhang, Y F; Liu, Z F; Duan, H L

    2013-03-13

    Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction.

  16. Monitoring the osmotic response of single yeast cells through force measurement in the environmental scanning electron microscope

    NASA Astrophysics Data System (ADS)

    Jansson, Anna; Nafari, Alexandra; Hedfalk, Kristina; Olsson, Eva; Svensson, Krister; Sanz-Velasco, Anke

    2014-02-01

    We present a measurement system that combines an environmental scanning electron microscope (ESEM) and an atomic force microscope (AFM). This combination enables studies of static and dynamic mechanical properties of hydrated specimens, such as individual living cells. The integrated AFM sensor provides direct and continuous force measurement based on piezoresistive force transduction, allowing the recording of events in the millisecond range. The in situ ESEM-AFM setup was used to study Pichia pastoris wild-type yeast cells. For the first time, a quantified measure of the osmotic response of an individual yeast cell inside an ESEM is presented. With this technique, cell size changes due to humidity variations can be monitored with nanometre accuracy. In addition, mechanical properties were extracted from load-displacement curves. A Young's modulus of 13-15 MPa was obtained for the P. pastoris yeast cells. The developed method is highly interesting as a complementary tool for the screening of drugs directed towards cellular water transport activity and provides new possibilities of studying mechanosensitive regulation of aquaporins.

  17. Parallel force measurement with a polymeric microbeam array using an optical microscope and micromanipulator.

    PubMed

    Sasoglu, F Mert; Bohl, Andrew J; Allen, Kathleen B; Layton, Bradley E

    2009-01-01

    An image analysis method and its validation are presented for tracking the displacements of parallel mechanical force sensors. Force is measured using a combination of beam theory, optical microscopy, and image analysis. The primary instrument is a calibrated polymeric microbeam array mounted on a micromanipulator with the intended purpose of measuring traction forces on cell cultures or cell arrays. One application is the testing of hypotheses involving cellular mechanotransduction mechanisms. An Otsu-based image analysis code calculates displacement and force on cellular or other soft structures by using edge detection and image subtraction on digitally captured optical microscopy images. Forces as small as 250+/-50 nN and as great as 25+/-2.5 microN may be applied and measured upon as few as one or as many as hundreds of structures in parallel. A validation of the method is provided by comparing results from a rigid glass surface and a compliant polymeric surface.

  18. Measurement of laterally induced optical forces at the nanoscale

    NASA Astrophysics Data System (ADS)

    Huang, Fei; Tamma, Venkata Ananth; Rajaei, Mohsen; Almajhadi, Mohammad; Kumar Wickramasinghe, H.

    2017-02-01

    We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a single nano-aperture in a gold film is mapped by measuring the lateral optical force between the apex of the AFM probe and the nano-aperture. The fundamental torsional eigen-mode of an AFM cantilever probe was used to detect the laterally induced optical forces. We engineered the cantilever shape using focused ion beam milling to improve the detected signal to noise ratio. The measured distributions of lateral optical force agree well with electromagnetic simulations of the metal coated AFM probe interacting with the nano-aperture. This technique can be extended to simultaneously detect both lateral and longitudinal optical forces at the nanoscale by using an AFM cantilever as a multi-channel detector. This will enable simultaneous Photon Induced Force Microscopy detection of molecular responses with different incident field polarizations. The technique can be implemented on both cantilever and tuning fork based AFMs.

  19. Force measurements on myelin basic protein adsorbed to mica and lipid bilayer surfaces done with the atomic force microscope.

    PubMed Central

    Mueller, H; Butt, H J; Bamberg, E

    1999-01-01

    The mechanical and adhesion properties of myelin basic protein (MBP) are important for its function, namely the compaction of the myelin sheath. To get more information about these properties we used atomic force microscopy to study tip-sample interaction of mica and mixed dioleoylphosphatidylserine (DOPS) (20%)/egg phosphatidylcholine (EPC) (80%) lipid bilayer surfaces in the absence and presence of bovine MBP. On mica or DOPS/EPC bilayers a short-range repulsive force (decay length 1.0-1.3 nm) was observed during the approach. The presence of MBP always led to an attractive force between tip and sample. When retracting the tip again, force curves on mica and on lipid layers were different. While attached to the mica surface, the MBP molecules exhibited elastic stretching behavior that agreed with the worm-like chain model, yielding a persistence length of 0.5 +/- 0.25 nm and an average contour length of 53 +/- 19 nm. MBP attached to a lipid bilayer did not show elastic stretching behavior. This shows that the protein adopts a different conformation when in contact with lipids. The lipid bilayer is strongly modified by MBP attachment, indicating formation of MBP-lipid complexes and possibly disruption of the original bilayer structure. PMID:9916039

  20. Dual-cut graphene transistors with constant-current regions fabricated by the atomic force microscope anode oxidation

    NASA Astrophysics Data System (ADS)

    Wu, Chong-Rong; Dou, Kun Peng; Wang, Cheng-Hung; Chang, Chung-En; Kaun, Chao-Cheng; Wu, Chao-Hsin; Lin, Shih-Yen

    2017-01-01

    Graphene bandgap opening is an important issue for the application of this material. We have demonstrated that by atomic force microscope (AFM) anode oxidation, long nonconductive oxidation lines can be fabricated on graphene surfaces. By using this fabrication technique with the dual-cut transistor architecture, the phenomenon of constant-current regions near the Dirac point can be observed in devices at room temperature when the cut separation is smaller than 100 nm. The results may provide evidence of the phenomenon of graphene bandgap opening at room temperature. The theoretical bandgap values are further estimated by density-function-derived tight-binding calculations.

  1. A study of the morphology of photochromic and thermochromic MoO 3 amorphous films using an atomic force microscope

    NASA Astrophysics Data System (ADS)

    Chudnovskii, F. A.; Schaefer, D. M.; Gavrilyuk, A. I.; Reifenberger, R.

    The surface morphology of amorphous MoO 3 films enhanced by a coating of N.N-dimethylformamide was studied with an atomic force microscope. Images of the as-grown films revealed a surface structure consisting of ˜25 nm diameter clusters which had coalesced to form irregular-shaped grains with dimensions ranging between 100 and 190 nm. Similar structure was found in the films after a photochromic or thermochromic transition had occured. The relative surface areas of the films have been calculated and little change is observed after the photochromic transition while a ˜29 increase in surface area is observed after the thermochromic transition has taken place.

  2. Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO_{3} Structural Phase Transition.

    PubMed

    Kisiel, M; Pellegrini, F; Santoro, G E; Samadashvili, M; Pawlak, R; Benassi, A; Gysin, U; Buzio, R; Gerbi, A; Meyer, E; Tosatti, E

    2015-07-24

    The critical fluctuations at second order structural transitions in a bulk crystal may affect the dissipation of mechanical probes even if completely external to the crystal surface. Here, we show that noncontact force microscope dissipation bears clear evidence of the antiferrodistortive phase transition of SrTiO_{3}, known for a long time to exhibit a unique, extremely narrow neutron scattering "central peak." The noncontact geometry suggests a central peak linear response coupling connected with strain. The detailed temperature dependence reveals for the first time the intrinsic central peak width of order 80 kHz, 2 orders of magnitude below the established neutron upper bound.

  3. Minimum surface-effect microgripper design for force-reflective telemanipulation of a microscopic environment

    NASA Technical Reports Server (NTRS)

    Goldfarb, Michael; Celanovic, Nikola

    1996-01-01

    This paper describes the fundamental physical motivations for a minimum surface effect design, and presents a microgripper that incorporates a piezoelectric ceramic actuator and a flexure-based structure and transmission. The microgripper serves effectively as a one degree-of-freedom prototype of a minimum surface effect micromanipulator design. Data is presented that characterizes the microgripper performance under both pure position and pure force control, followed by a discussion of the attributes and limitations of flexure-based design. The microgripper is interfaced with a force reflective macrogripper, and the pair is controlled with a hybrid position/force scheme. Data is presented that illustrates the effective operation of the telerobotic pair.

  4. Minimum Surface-Effect Microgripper Design for Force-Reflective Telemanipulation of a Microscopic Environment

    NASA Technical Reports Server (NTRS)

    Goldfarb, Michael; Celanovic, Nikola

    1996-01-01

    This paper describes the fundamental physical motivations for minimum surface effect design, and presents a microgripper that incorporates a piezoelectric ceramic actuator and a flexure-based structure and transmission. The microgripper serves effectively as a one degree-of-freedom prototype of minimum surface effect micromanipulator design. Data is presented that characterizes the microgripper performance under both pure position and pure force control, followed by a discussion of the attributes and limitations of flexure-based design. The microgripper is interfaced with a force-reflective macrogripper, and the pair controlled with a hybrid position/force scheme. Data is presented that illustrates the effective operation of the telerobotic pair.

  5. Harnessing the damping properties of materials for high-speed atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Adams, Jonathan D.; Erickson, Blake W.; Grossenbacher, Jonas; Brugger, Juergen; Nievergelt, Adrian; Fantner, Georg E.

    2016-02-01

    The success of high-speed atomic force microscopy in imaging molecular motors, enzymes and microbes in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic force microscopy experiments are performed in air, and the tapping-mode detection speed of current high-speed cantilevers is an order of magnitude lower in air than in liquids. Traditional approaches to increasing the imaging rate of atomic force microscopy have involved reducing the size of the cantilever, but further reductions in size will require a fundamental change in the detection method of the microscope. Here, we show that high-speed imaging in air can instead be achieved by changing the cantilever material. We use cantilevers fabricated from polymers, which can mimic the high damping environment of liquids. With this approach, SU-8 polymer cantilevers are developed that have an imaging-in-air detection bandwidth that is 19 times faster than those of conventional cantilevers of similar size, resonance frequency and spring constant.

  6. Micromechanical contact stiffness devices and application for calibrating contact resonance atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Rosenberger, Matthew R.; Chen, Sihan; Prater, Craig B.; King, William P.

    2017-01-01

    This paper reports the design, fabrication, and characterization of micromechanical devices that can present an engineered contact stiffness to an atomic force microscope (AFM) cantilever tip. These devices allow the contact stiffness between the AFM tip and a substrate to be easily and accurately measured, and can be used to calibrate the cantilever for subsequent mechanical property measurements. The contact stiffness devices are rigid copper disks of diameters 2-18 μm integrated onto a soft silicone substrate. Analytical modeling and finite element simulations predict the elastic response of the devices. Measurements of tip-sample interactions during quasi-static force measurements compare well with modeling simulation, confirming the expected elastic response of the devices, which are shown to have contact stiffness 32-156 N m-1. To demonstrate one application, we use the disk sample to calibrate three resonant modes of a U-shaped AFM cantilever actuated via Lorentz force, at approximately 220, 450, and 1200 kHz. We then use the calibrated cantilever to determine the contact stiffness and elastic modulus of three polymer samples at these modes. The overall approach allows cantilever calibration without prior knowledge of the cantilever geometry or its resonance modes, and could be broadly applied to both static and dynamic measurements that require AFM calibration against a known contact stiffness.

  7. Mechanical behavior simulation of MEMS-based cantilever beam using COMSOL multiphysics

    SciTech Connect

    Acheli, A. Serhane, R.

    2015-03-30

    This paper presents the studies of mechanical behavior of MEMS cantilever beam made of poly-silicon material, using the coupling of three application modes (plane strain, electrostatics and the moving mesh) of COMSOL Multi-physics software. The cantilevers playing a key role in Micro Electro-Mechanical Systems (MEMS) devices (switches, resonators, etc) working under potential shock. This is why they require actuation under predetermined conditions, such as electrostatic force or inertial force. In this paper, we present mechanical behavior of a cantilever actuated by an electrostatic force. In addition to the simplification of calculations, the weight of the cantilever was not taken into account. Different parameters like beam displacement, electrostatics force and stress over the beam have been calculated by finite element method after having defining the geometry, the material of the cantilever model (fixed at one of ends but is free to move otherwise) and his operational space.

  8. Fluorescence modulation of single CdSe nanowires by charge injection through the tip of an atomic-force microscope.

    PubMed

    Schäfer, Sebastian; Wang, Zhe; Kipp, Tobias; Mews, Alf

    2011-09-23

    We demonstrate a direct correlation between the charge state and photoluminescence (PL) intensity of individual CdSe nanowires by actively charging them and performing electrostatic force microscopy and PL measurements simultaneously. While the injection of positive charges leads to an immediate PL quenching, a small amount of injected electrons can lead to an increase of the PL intensity. We directly observed the migration of excess charges into the substrate, which leads to a recovery of the PL. Further, we show that the PL of individual NWs can be actively switched between on and off states by charging with the atomic-force microscope tip. We propose a model based on charge trapping and migration into the substrate to explain our results.

  9. Bias-assisted atomic force microscope nanolithography on NbS2 thin films grown by chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Bark, Hunyoung; Kwon, Sanghyuk; Lee, Changgu

    2016-12-01

    Niobium disulfide, one of the metallic transition metal dichalcogenides, has a high potential as an electrode material for electronic devices made of 2D materials. Here, we investigated the bias-assisted atomic force microscope nanolithography of NbS2 thin films synthesized by chemical vapor deposition. We analyzed the lithographed pattern using Raman spectroscopy, transmission electron microscopy and friction force microscopy. These analyses showed that lines having various widths and thicknesses could be generated using the lithography technique by simply varying the scan speed and applied voltage. These analyses also revealed that the NbS2 film transformed from a layered crystalline structure into an amorphous structure upon being lithographed. By generating four line segments forming a square and measuring I/V curves inside and outside of the square, the electrical properties of the lithographed material were characterized. These analyses indicate that NbS2 became hydrogenated and an insulator upon being lithographed.

  10. DNA nanofilm thickness measurement on microarray in air and in liquid using an atomic force microscope.

    PubMed

    Legay, Guillaume; Finot, Eric; Meunier-Prest, Rita; Cherkaoui-Malki, Mustapha; Latruffe, Norbert; Dereux, Alain

    2005-10-15

    The measurement of the thickness of DNA films on microarray as a function of the medium (liquid, air) is gaining importance for understanding the signal response of biosensors. Thiol group has been used to attach DNA strands to gold micropads deposited on silicon surface. Atomic force microscopy (AFM) was employed in its height mode to measure the change in the pad thickness and in its force mode to measure the indentation depth of the nanofilm. A good coherence between the height and force modes is observed for the film thickness in air. The adhesion force was found to be an alternative way to measure the surface coverage of the biolayer at nanoscopic scale. However the force analysis (compression, steric and electrostatic) provides baseline information necessary to interpret the AFM height image in liquid. Analysis of the film thickness distribution shows that the height of the DNA strands depends on both the DNA strand length (15-35 base pairs) and the environment (air, liquid). In air, longer strands lay down onto gold surface whereas the charge reversal of gold in liquid causes a repulsion of longer strands, which stand up.

  11. Intracellular nanomanipulation by a photonic-force microscope with real-time acquisition of a 3D stiffness matrix

    NASA Astrophysics Data System (ADS)

    Bertseva, E.; Singh, A. S. G.; Lekki, J.; Thévenaz, P.; Lekka, M.; Jeney, S.; Gremaud, G.; Puttini, S.; Nowak, W.; Dietler, G.; Forró, L.; Unser, M.; Kulik, A. J.

    2009-07-01

    A traditional photonic-force microscope (PFM) results in huge sets of data, which requires tedious numerical analysis. In this paper, we propose instead an analog signal processor to attain real-time capabilities while retaining the richness of the traditional PFM data. Our system is devoted to intracellular measurements and is fully interactive through the use of a haptic joystick. Using our specialized analog hardware along with a dedicated algorithm, we can extract the full 3D stiffness matrix of the optical trap in real time, including the off-diagonal cross-terms. Our system is also capable of simultaneously recording data for subsequent offline analysis. This allows us to check that a good correlation exists between the classical analysis of stiffness and our real-time measurements. We monitor the PFM beads using an optical microscope. The force-feedback mechanism of the haptic joystick helps us in interactively guiding the bead inside living cells and collecting information from its (possibly anisotropic) environment. The instantaneous stiffness measurements are also displayed in real time on a graphical user interface. The whole system has been built and is operational; here we present early results that confirm the consistency of the real-time measurements with offline computations.

  12. Force feedback microscopy based on an optical beam deflection scheme

    SciTech Connect

    Vitorino, Miguel V.; Rodrigues, Mario S.; Carpentier, Simon; Costa, Luca

    2014-07-07

    Force feedback microscopy circumvents the jump to contact in atomic force microscopy when using soft cantilevers and quantitatively measures the interaction properties at the nanoscale by simultaneously providing force, force gradient, and dissipation. The force feedback microscope developed so far used an optical cavity to measure the tip displacement. In this Letter, we show that the more conventional optical beam deflection scheme can be used to the same purpose. With this instrument, we have followed the evolution of the Brownian motion of the tip under the influence of a water bridge.

  13. Gland With Cantilever Seal

    NASA Technical Reports Server (NTRS)

    Melton, Patrick B.

    1989-01-01

    Single-piece gland forms tight seal on probe or tube containing liquid or gas at high pressure. Gland and probe align as assembled by simple torquing procedure. Disconnected easily and reused at same site. Made from any of wide variety of materials so compatible with application. Cantilever ring at top of gland bites into wall of tube or probe, sealing it. Wall of tube or probe must be thick enough to accommodate deformation without rupturing. Maximum deformation designed in coordination with seating and deformation of boss or conical seal.

  14. Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions.

    PubMed

    Vakhshouri, Amin; Hashimoto, Katsushi; Hirayama, Yoshiro

    2014-12-01

    We have developed a method of atomic force microscopy (AFM)-assisted scanning tunneling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip-sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.

  15. The Intrinsic Resolution Limit in the Atomic Force Microscope: Implications for Heights of Nano-Scale Features

    PubMed Central

    Santos, Sergio; Barcons, Victor; Christenson, Hugo K.; Font, Josep; Thomson, Neil H.

    2011-01-01

    Background Accurate mechanical characterization by the atomic force microscope at the highest spatial resolution requires that topography is deconvoluted from indentation. The measured height of nanoscale features in the atomic force microscope (AFM) is almost always smaller than the true value, which is often explained away as sample deformation, the formation of salt deposits and/or dehydration. We show that the real height of nano-objects cannot be obtained directly: a result arising as a consequence of the local probe-sample geometry. Methods and Findings We have modeled the tip-surface-sample interaction as the sum of the interaction between the tip and the surface and the tip and the sample. We find that the dynamics of the AFM cannot differentiate between differences in force resulting from 1) the chemical and/or mechanical characteristics of the surface or 2) a step in topography due to the size of the sample; once the size of a feature becomes smaller than the effective area of interaction between the AFM tip and sample, the measured height is compromised. This general result is a major contributor to loss of height and can amount to up to ∼90% for nanoscale features. In particular, these very large values in height loss may occur even when there is no sample deformation, and, more generally, height loss does not correlate with sample deformation. DNA and IgG antibodies have been used as model samples where experimental height measurements are shown to closely match the predicted phenomena. Conclusions Being able to measure the true height of single nanoscale features is paramount in many nanotechnology applications since phenomena and properties in the nanoscale critically depend on dimensions. Our approach allows accurate predictions for the true height of nanoscale objects and will lead to reliable mechanical characterization at the highest spatial resolution. PMID:21912608

  16. Measurement of Mechanical Properties of Cantilever Shaped Materials

    PubMed Central

    Finot, Eric; Passian, Ali; Thundat, Thomas

    2008-01-01

    Microcantilevers were first introduced as imaging probes in Atomic Force Microscopy (AFM) due to their extremely high sensitivity in measuring surface forces. The versatility of these probes, however, allows the sensing and measurement of a host of mechanical properties of various materials. Sensor parameters such as resonance frequency, quality factor, amplitude of vibration and bending due to a differential stress can all be simultaneously determined for a cantilever. When measuring the mechanical properties of materials, identifying and discerning the most influential parameters responsible for the observed changes in the cantilever response are important. We will, therefore, discuss the effects of various force fields such as those induced by mass loading, residual stress, internal friction of the material, and other changes in the mechanical properties of the microcantilevers. Methods to measure variations in temperature, pressure, or molecular adsorption of water molecules are also discussed. Often these effects occur simultaneously, increasing the number of parameters that need to be concurrently measured to ensure the reliability of the sensors. We therefore systematically investigate the geometric and environmental effects on cantilever measurements including the chemical nature of the underlying interactions. To address the geometric effects we have considered cantilevers with a rectangular or circular cross section. The chemical nature is addressed by using cantilevers fabricated with metals and/or dielectrics. Selective chemical etching, swelling or changes in Young's modulus of the surface were investigated by means of polymeric and inorganic coatings. Finally to address the effect of the environment in which the cantilever operates, the Knudsen number was determined to characterize the molecule-cantilever collisions. Also bimaterial cantilevers with high thermal sensitivity were used to discern the effect of temperature variations. When appropriate

  17. Atomic force microscope nanolithography: dip-pen, nanoshaving, nanografting, tapping mode, electrochemical and thermal nanolithography.

    PubMed

    Rosa, Luis G; Liang, Jian

    2009-12-02

    Atomic force microscopy (AFM) has been widely employed as a nanoscopic lithography technique. In this review, we summarize the current state of research in this field. We introduce the various forms of the technique, such as nanoshaving, nanografting and dip-pen nanolithography, which we classify according to the different interactions between the AFM probe and the substrate during the nanolithography fabrication process. Mechanical force, applied by the tip to the substrate, is the variable that can be controlled with good precision in AFM and it has been utilized in patterning self-assembled monolayers. In such applications, the AFM tip can break some relatively weak chemical bonds inside the monolayer. In general, the state of the art for AFM nanolithography demonstrates the power, resolution and versatility of the technique.

  18. SU-8 hollow cantilevers for AFM cell adhesion studies

    NASA Astrophysics Data System (ADS)

    Martinez, Vincent; Behr, Pascal; Drechsler, Ute; Polesel-Maris, Jérôme; Potthoff, Eva; Vörös, Janos; Zambelli, Tomaso

    2016-05-01

    A novel fabrication method was established to produce flexible, transparent, and robust tipless hollow atomic force microscopy (AFM) cantilevers made entirely from SU-8. Channels of 3 μm thickness and several millimeters length were integrated into 12 μm thick and 40 μm wide cantilevers. Connected to a pressure controller, the devices showed high sealing performance with no leakage up to 6 bars. Changing the cantilever lengths from 100 μm to 500 μm among the same wafer allowed the targeting of various spring constants ranging from 0.5 to 80 N m-1 within a single fabrication run. These hollow polymeric AFM cantilevers were operated in the optical beam deflection configuration. To demonstrate the performance of the device, single-cell force spectroscopy experiments were performed with a single probe detaching in a serial protocol more than 100 Saccharomyces cerevisiae yeast cells from plain glass and glass coated with polydopamine while measuring adhesion forces in the sub-nanoNewton range. SU-8 now offers a new alternative to conventional silicon-based hollow cantilevers with more flexibility in terms of complex geometric design and surface chemistry modification.

  19. Direct visualization and identification of biofunctionalized nanoparticles using a magnetic atomic force microscope.

    PubMed

    Block, Stephan; Glöckl, Gunnar; Weitschies, Werner; Helm, Christiane A

    2011-09-14

    Because of its outstanding ability to image and manipulate single molecules, atomic force microscopy (AFM) established itself as a fundamental technique in nanobiotechnology. (1) We present a new modality that distinguishes single nanoparticles by the surrounding magnetic field gradient. Diamagnetic gold and superparamagnetic iron oxide nanoparticles become discernible under ambient conditions. Images of proteins, magnetolabeled with nanoparticles, demonstrate the first steps toward a magnetic analogue to fluorescence microscopy, which combines nanoscale lateral resolution of AFM with unambiguous detection of magnetic markers.

  20. Application of a 2-D atomic force microscope system to metrology

    NASA Astrophysics Data System (ADS)

    Nyyssonen, Diana; Landstein, Laszlo; Coombs, E.

    1992-02-01

    This paper describes a 2-D atomic force microprobe (AFM) system designed specifically for accurate submicron critical dimension (CD) metrology. The system includes 2-D AFM sensing, 3-D position interferometry with 1.25 nm sensitivity, and a special tip design. Unlike conventional AFM scanning systems, the system operates like a nanorobot moving from point to point under computer control and sensing surfaces without making contact. The system design, operating characteristics, and application to metrology are

  1. Imaging Carbon Nanotubes in High Performance Polymer Composites via Magnetic Force Microscope

    NASA Technical Reports Server (NTRS)

    Lillehei, Peter T.; Park, Cheol; Rouse, Jason H.; Siochi, Emilie J.; Bushnell, Dennis M. (Technical Monitor)

    2002-01-01

    Application of carbon nanotubes as reinforcement in structural composites is dependent on the efficient dispersion of the nanotubes in a high performance polymer matrix. The characterization of such dispersion is limited by the lack of available tools to visualize the quality of the matrix/carbon nanotube interaction. The work reported herein demonstrates the use of magnetic force microscopy (MFM) as a promising technique for characterizing the dispersion of nanotubes in a high performance polymer matrix.

  2. The height of biomolecules measured with the atomic force microscope depends on electrostatic interactions.

    PubMed Central

    Müller, D J; Engel, A

    1997-01-01

    In biological applications of atomic force microscopy, the different surface properties of the biological sample and its support become apparent. Observed height differences between the biomolecule and its supporting surface are thus not only of structural origin, but also depend on the different sample-tip and support-tip interactions. This can result in negative or positive contributions to the measured height, effects that are described by the DLVO (Derjaguin, Landau, Verwey, Overbeek) theory. Experimental verification shows that the electrostatic interactions between tip and sample can strongly influence the result obtained. To overcome this problem, pH and electrolyte concentration of the buffer solution have to be adjusted to screen out electrostatic forces. Under these conditions, the tip comes into direct contact with the surface of support and biological system, even when low forces required to prevent sample deformation are applied. In this case, the measured height can be related to the thickness of the native biological structure. The observed height dependence of the macromolecules on electrolyte concentration makes it possible to estimate surface charge densities. Images FIGURE 1 FIGURE 2 FIGURE 8 FIGURE 10 FIGURE 11 PMID:9284330

  3. Force Spectroscopy of Collagen Fibers to Investigate Their Mechanical Properties and Structural Organization

    PubMed Central

    Gutsmann, Thomas; Fantner, Georg E.; Kindt, Johannes H.; Venturoni, Manuela; Danielsen, Signe; Hansma, Paul K.

    2004-01-01

    Tendons are composed of collagen and other molecules in a highly organized hierarchical assembly, leading to extraordinary mechanical properties. To probe the cross-links on the lower level of organization, we used a cantilever to pull substructures out of the assembly. Advanced force probe technology, using small cantilevers (length <20 μm), improved the force resolution into the sub-10 pN range. In the force versus extension curves, we found an exponential increase in force and two different periodic rupture events, one with strong bonds (jumps in force of several hundred pN) with a periodicity of 78 nm and one with weak bonds (jumps in force of <7 pN) with a periodicity of 22 nm. We demonstrate a good correlation between the measured mechanical behavior of collagen fibers and their appearance in the micrographs taken with the atomic force microscope. PMID:15111431

  4. Note: Mechanical etching of atomic force microscope tip and microsphere attachment for thermal radiation scattering enhancement

    SciTech Connect

    Brissinger, D.; Parent, G. Lacroix, D.

    2013-12-15

    This Note describes a mechanical etching technique which can be used to prepare silicon tips used in atomic force microscopy apparatus. For such devices, dedicated tips with specific shapes are now commonly used to probe surfaces. Yet, the control of the tip morphology where characteristic scales are lower than 1 μm remains a real challenge. Here, we detail a controlled etching process of AFM probes apex allowing micrometer-sized sphere attachment. The technique used and influent parameters are discussed and SEM images of the achieved tips are given. Deceptive problems and drawbacks that might occur during the process are also covered.

  5. Atomic force microscope studies of fullerene films - Highly stable C60 fcc (311) free surfaces

    NASA Technical Reports Server (NTRS)

    Snyder, Eric J.; Tong, William M.; Williams, R. S.; Anz, Samir J.; Anderson, Mark S.

    1991-01-01

    Atomic force microscopy and X-ray diffractometry were used to study 1500 A-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrte. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

  6. High-resolution surface charge image achieved by a multiforce sensor based on a quartz tuning fork in electrostatic force microscope

    NASA Astrophysics Data System (ADS)

    Wang, Zhi-yong; Bao, Jian-bin; Zhang, Hong-hai; Guo, Wen-ming

    2002-08-01

    A multiforce sensor was fabricated by attaching a tiny tungsten tip to a tuning fork. By operating an ac modulation bias on the minitip of the needle sensor, we have achieved a dynamic noncontact mode electrostatic force microscope with high spatial resolution. It can utilize the van der Waals force and electrostatic force signals between the microtip and the sample, respectively, to obtain the images of topography and quantitative surface charge density of an open-gate field effect transistor simultaneously.

  7. Measurement of solution viscosity by atomic force microscopy

    NASA Astrophysics Data System (ADS)

    Ahmed, Nabil; Nino, Diego F.; Moy, Vincent T.

    2001-06-01

    We report on studies aimed at employing the atomic force microscope (AFM) to measure the viscosity of aqueous solutions. At ambient temperature, the AFM cantilever undergoes thermal fluctuations that are highly sensitive to the local environment. Here, we present measurements of the cantilever's resonant frequency in aqueous solutions of glycerol, sucrose, ethanol, sodium chloride, polyethylene glycol, and bovine plasma albumin. The measurements revealed that variations in the resonant frequency of the cantilever in the different solutions are largely dependent on the viscosity of the medium. An application of this technique is to monitor the progression of a chemical reaction where a change in viscosity is expected to occur. An example is demonstrated through monitoring of the hydrolysis of double stranded deoxyribonucleic acid by DNase I.

  8. Nanoscale Subsurface Imaging of Nanocomposites via Resonant Difference-Frequency Atomic Force Ultrasonic Microscopy

    NASA Technical Reports Server (NTRS)

    Cantrell, Sean A.; Cantrell, John H.; Lillehei, Peter T.

    2007-01-01

    A scanning probe microscope methodology, called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), has been developed. The method employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope engages the sample top surface. The cantilever is driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave at the sample surface generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create amplitude and phase-generated images of nanoscale near-surface and subsurface features. RDF-AFUM phase images of LaRC-CP2 polyimide polymer containing embedded nanostructures are presented. A RDF-AFUM micrograph of a 12.7 micrometer thick film of LaRC-CP2 containing a monolayer of gold nanoparticles embedded 7 micrometers below the specimen surface reveals the occurrence of contiguous amorphous and crystalline phases within the bulk of the polymer and a preferential growth of the crystalline phase in the vicinity of the gold nanoparticles. A RDF-AFUM micrograph of LaRC-CP2 film containing randomly dispersed carbon nanotubes reveals the growth of an interphase region at certain nanotube-polymer interfaces.

  9. Domain reversal and relaxation in LiNbO3 single crystals studied by piezoresponse force microscope

    NASA Astrophysics Data System (ADS)

    Kan, Yi; Lu, Xiaomei; Wu, Xiumei; Zhu, Jinsong

    2006-12-01

    The LiNbO3 crystal was polarized and characterized by the piezoresponse force mode of scanning probe microscope. By using the Kolmogorov-Avrami-Ishibashi [Izv. Akad. Nauk, USSR: Ser. Math. 3, 355 (1937); J. Chem. Phys. 8, 212 (1940); J. Phys. Soc. Jpn. 63, 1031 (1994); 63, 1601 (1994)] theory to analyze the relaxation process after domain switching, it was found that (1) the percent of final switched domains after poling increased with the enhancing poling voltage, (2) the nucleation time was a constant to a certain sample, (3) the dimension of domain growth decreased with the enhancing poling voltage, and (4) the relaxation time had a maximum at a medial voltage. The corresponding mechanism for domain switching was discussed, which is hopefully useful for domain engineering.

  10. Note: Fabrication of a fast-response and user-friendly environmental chamber for atomic force microscopes

    NASA Astrophysics Data System (ADS)

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Han, Tingting; Song, Xiaoxue; Pan, Chengbin; Lanza, Mario

    2015-10-01

    The atomic force microscope is one of the most widespread tools in science, but many suppliers do not provide a competitive solution to make experiments in controlled atmospheres. Here, we provide a solution to this problem by fabricating a fast-response and user-friendly environmental chamber. We corroborate the correct functioning of the chamber by studying the formation of local anodic oxidation on a silicon sample (biased under opposite polarities), an effect that can be suppressed by measuring in a dry nitrogen atmosphere. The usefulness of this chamber goes beyond the example here presented, and it could be used in many other fields of science, including physics, mechanics, microelectronics, nanotechnology, medicine, and biology.

  11. Molecular workbench for imaging and manipulation of single macromolecules and their complexes with the scanning force microscope.

    PubMed

    Rabe, Jürgen P

    2008-01-01

    The structure and properties of single macromolecules are key to understanding function in biologicalmolecular systems, as well as to developing artificial functional systems. In order to systematicallyinvestigate and control the conformations of single macromolecules and their complexes a "molecularworkbench" has been developed. It consists of an atomically flat, inert solid substrate suchas the basal plane of highly oriented pyrolytic graphite (HOPG), coated with a layer of moleculessuch as alkanes or alkyl chains containing amphiphiles that control the interaction between the substrateand adsorbed macromolecules. A scanning force microscope (SFM) operated in tapping or contactmode is used to both image and manipulate the macromolecules to correlate their structure with mechanicalproperties, and to assemble macromolecular systems that would not form spontaneously.

  12. Atomic force microscopic study of the structure of high-density polyethylene deformed in liquid medium by crazing mechanism.

    PubMed

    Bagrov, D V; Yarysheva, A Y; Rukhlya, E G; Yarysheva, L M; Volynskii, A L; Bakeev, N F

    2014-02-01

    A procedure has been developed for the direct atomic force microscopic (AFM) examination of the native structure of high-density polyethylene (HDPE) deformed in an adsorption-active liquid medium (AALM) by the crazing mechanism. The AFM investigation has been carried out in the presence of a liquid medium under conditions preventing deformed films from shrinkage. Deformation of HDPE in AALM has been shown to proceed through the delocalized crazing mechanism and result in the development of a fibrillar-porous structure. The structural parameters of the crazed polymer have been determined. The obtained AFM images demonstrate a nanosized nonuniformity of the deformation and enable one to observe the structural rearrangements that take place in the deformed polymer after removal of the liquid medium and stress relaxation. A structural similarity has been revealed between HDPE deformed in the AALM and hard elastic polymers.

  13. Note: Fabrication of a fast-response and user-friendly environmental chamber for atomic force microscopes

    SciTech Connect

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Han, Tingting; Song, Xiaoxue; Pan, Chengbin; Lanza, Mario

    2015-10-15

    The atomic force microscope is one of the most widespread tools in science, but many suppliers do not provide a competitive solution to make experiments in controlled atmospheres. Here, we provide a solution to this problem by fabricating a fast-response and user-friendly environmental chamber. We corroborate the correct functioning of the chamber by studying the formation of local anodic oxidation on a silicon sample (biased under opposite polarities), an effect that can be suppressed by measuring in a dry nitrogen atmosphere. The usefulness of this chamber goes beyond the example here presented, and it could be used in many other fields of science, including physics, mechanics, microelectronics, nanotechnology, medicine, and biology.

  14. Note: Fabrication of a fast-response and user-friendly environmental chamber for atomic force microscopes.

    PubMed

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Han, Tingting; Song, Xiaoxue; Pan, Chengbin; Lanza, Mario

    2015-10-01

    The atomic force microscope is one of the most widespread tools in science, but many suppliers do not provide a competitive solution to make experiments in controlled atmospheres. Here, we provide a solution to this problem by fabricating a fast-response and user-friendly environmental chamber. We corroborate the correct functioning of the chamber by studying the formation of local anodic oxidation on a silicon sample (biased under opposite polarities), an effect that can be suppressed by measuring in a dry nitrogen atmosphere. The usefulness of this chamber goes beyond the example here presented, and it could be used in many other fields of science, including physics, mechanics, microelectronics, nanotechnology, medicine, and biology.

  15. Cantilever epitaxial process

    DOEpatents

    Ashby, Carol I.; Follstaedt, David M.; Mitchell, Christine C.; Han, Jung

    2003-07-29

    A process of growing a material on a substrate, particularly growing a Group II-VI or Group III-V material, by a vapor-phase growth technique where the growth process eliminates the need for utilization of a mask or removal of the substrate from the reactor at any time during the processing. A nucleation layer is first grown upon which a middle layer is grown to provide surfaces for subsequent lateral cantilever growth. The lateral growth rate is controlled by altering the reactor temperature, pressure, reactant concentrations or reactant flow rates. Semiconductor materials, such as GaN, can be produced with dislocation densities less than 10.sup.7 /cm.sup.2.

  16. Note: A stand on the basis of atomic force microscope to study substrates for imaging optics

    SciTech Connect

    Chkhalo, N. I.; Salashchenko, N. N.; Zorina, M. V.

    2015-01-15

    A description of a stand based on atomic force microscopy (AFM) for roughness measurements of large optical components with arbitrary surfaces is given. The sample under study is mounted on a uniaxial goniometer which allows the sample to be tilted in the range of ±30°. The inclination enables the local normal along the axis of the probe to be established at any point of the surface under study. A comparison of the results of the measurement of noise and roughness of a flat quartz sample, in the range of spatial frequencies 0.025–70 μm{sup −1}, obtained from “standard” AFM and developed versions is given. Within the experimental error, the measurement results were equivalent. Examples of applications of the stand for the study of substrates for X-ray optics are presented.

  17. The possibility of multi-layer nanofabrication via atomic force microscope-based pulse electrochemical nanopatterning.

    PubMed

    Kim, Uksu; Morita, Noboru; Lee, Deug; Jun, Martin; Park, Jeong Woo

    2017-03-27

    Pulse electrochemical nanopatterning (PECN), a non-contact scanning probe lithography (NC-SPL) process using ultrashort voltage pulses, is based primarily on an electrochemical machining (ECM) process using localized electrochemical oxidation between a sharp tool tip and the sample surface. In this study, nanoscale oxide patterns were formed on silicon Si (100) wafer surfaces via electrochemical surface nanopatterning, by supplying external pulsed currents through non-contact atomic force microscopy. Nanoscale oxide width and height were controlled by modulating the applied pulse duration. Additionally, protruding nanoscale oxides were removed completely by simple chemical etching, showing a depressed pattern on the sample substrate surface. Nanoscale two-dimensional oxides, prepared by a localized electrochemical reaction, can be defined easily by controlling physical and electrical variables, before proceeding further to a layer-by-layer nanofabrication process.

  18. System design and new applications for atomic force microscope based on tunneling

    NASA Astrophysics Data System (ADS)

    Wang, X.; Liu, A. P.; Yang, X. H.

    2015-09-01

    The design of atomic force microscopy (AFM) with high resolution is introduced in this paper. Mainly, we have developed the system design of the apparatus based on tunneling. AFM.IPC-208B, this kind of apparatus combines scanning tunnel microscopy (STM) and AFM availability, and its lens body with original frame enhances the capability of the machine. In order to analyze the performance of AFM.IPC-208B, as a new tool in the field of Life Science, we make use of the system to study natural mica and molecular protein structures of Cattle-insulin and human antibody immunoglobulin G (IgG) coupled with staphylococcus protein A (SPA). As the results of new applications, the resolution of AFM.IPC-208B is proved to be 0.1 nm, and these nanometer measurement results provide much valuable information for the study of small molecular proteins and HIV experiments.

  19. Adsorption behavior of mercury on functionalized aspergillus versicolor mycelia: atomic force microscopic study.

    PubMed

    Das, Sujoy K; Das, Akhil R; Guha, Arun K

    2009-01-06

    The adsorption characteristics of mercury on Aspergillus versicolor mycelia have been studied under varied environments. The mycelia are functionalized by carbon disulfide (CS(2)) treatment under alkaline conditions to examine the enhance uptake capacity and explore its potentiality in pollution control management. The functionalized A. versicolor mycelia have been characterized by scanning electron microscopy-energy dispersive X-ray analysis (SEM-EDXA), attenuated total reflection infrared (ATR-IR), and atomic force microscopy (AFM) probing. SEM and AFM images exhibit the formation of nanoparticles on the mycelial surface. ATR-IR profile confirms the functionalization of the mycelia following chemical treatment. ATR-IR and EDXA results demonstrate the binding of the sulfur groups of the functionalized mycelia to the mercury and consequent formation metal sulfide. AFM study reveals that the mycelial surface is covered by a layer of densely packed domain like structures. Sectional analysis yields significant increase in average roughness (R(rms)) value (20.5 +/- 1.82 nm) compared to that of the pristine mycelia (4.56 +/- 0.82 nm). Surface rigidity (0.88 +/- 0.06 N/m) and elasticity (92.6 +/- 10.2 MPa) obtained from a force distance curve using finite element modeling are found to increase significantly with respect to the corresponding values of (0.65 +/- 0.05 N/m and 32.8 +/- 4.5 MPa) of the nonfunctionalized mycelia. The maximum mercury adsorption capacity of the functionalized mycelia is observed to be 256.5 mg/g in comparison to 80.71 mg/g for the pristine mycelia.

  20. Chemical sensor with oscillating cantilevered probe

    DOEpatents

    Adams, Jesse D

    2013-02-05

    The invention provides a method of detecting a chemical species with an oscillating cantilevered probe. A cantilevered beam is driven into oscillation with a drive mechanism coupled to the cantilevered beam. A free end of the oscillating cantilevered beam is tapped against a mechanical stop coupled to a base end of the cantilevered beam. An amplitude of the oscillating cantilevered beam is measured with a sense mechanism coupled to the cantilevered beam. A treated portion of the cantilevered beam is exposed to the chemical species, wherein the cantilevered beam bends when exposed to the chemical species. A second amplitude of the oscillating cantilevered beam is measured, and the chemical species is determined based on the measured amplitudes.

  1. Frequency Response of Nanoelectromechanical Cantilevers Operating in Fluid

    DTIC Science & Technology

    2008-08-01

    losses. These losses can be computed using the Navier - Stokes equations on the cantilever cross- section. [9]- [12] Navier - Stokes solvers have been...frequency ω: )sin()( tFtF o ω= . (8) The viscous drag force is computed by solving the time- dependent Navier - Stokes ...Solution of the velocity and pressure using a time- dependent Navier - Stokes algorithm. 2. Computation of the fluid force, spring force, and

  2. Atomic force microscope study of chromatic transitions in polydiacetylene thin films

    SciTech Connect

    Lio, A.; Reichert, A.; Nagy, J.O.; Salmeron, M.; Charych, D.H.

    1996-03-01

    Despite decades of study, the exact mechanism for chromatic transitions in polydiacetylene materials remains somewhat elusive. The mechanism of the blue to red color transition for overcompressed mixed lipid thin films of 10,12 pentacosadiynoic acid has been investigated by atomic force microscopy. Blue layers were prepared by the horizontal Langmuir{endash}Schaefer deposition method. The red form was attained by thermal annealing of blue films (thermochromism). The blue films reveal micro-sized domains. Each domain shows a stripelike morphology on top of a nearly complete layer. The polymer backbone direction shows a high degree of order. A partial disorder is shown to exist along the interbackbone direction. Our study of the red form films indicates that changes occur in the micron-scale morphology of the films. Interestingly the alkyl side chains rearrange into a completely ordered structure and remain ordered well beyond the transition temperature (70{degree}C{lt}{ital T}{lt}90{degree}C). Our results strongly suggest that the reorganization of the side chains is the origin of the thermochromic effect for these films. {copyright} {ital 1996 American Vacuum Society}

  3. Continuous electrospinning of polymer nanofibers of Nylon-6 using an atomic force microscope tip.

    PubMed

    Gururajan, Giriprasath; Sullivan, S P; Beebe, T P; Chase, D B; Rabolt, J F

    2011-08-01

    An atomic force microscopy (AFM) probe is successfully utilized as an electrospinning tip for fabricating Nylon-6 nanofibers. The nanometre-size tip enabled controlled deposition of uniform polymeric nanofibers within a 1 cm diameter area. Nylon-6 nanofibers were continuously electrospun at a solution concentration as low as 1 wt% Nylon-6 in 1,1,1,3,3,3-hexafluoro-2-propanol (HFIP). Wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC) results of the AFM electrospun fibers indicated that the nanofibers predominantly display the meta-stable γ crystalline form suggesting rapid crystallization rate during the process. In addition to precise control over fiber deposition and diameter, some of the drawbacks of conventional electrospinning such as large volume of solutions and clogging of needles can be overcome using this AFM based electrospinning technique. Lastly, a comparison of electrospun fibers from syringe-needle based electrospinning and AFM probe-tip based electrospinning indicated significant morphological and microstructural differences in the case of AFM based electrospinning.

  4. Continuous electrospinning of polymer nanofibers of Nylon-6 using an atomic force microscope tip

    NASA Astrophysics Data System (ADS)

    Gururajan, Giriprasath; Sullivan, S. P.; Beebe, T. P.; Chase, D. B.; Rabolt, J. F.

    2011-08-01

    An atomic force microscopy (AFM) probe is successfully utilized as an electrospinning tip for fabricating Nylon-6 nanofibers. The nanometre-size tip enabled controlled deposition of uniform polymeric nanofibers within a 1 cm diameter area. Nylon-6 nanofibers were continuously electrospun at a solution concentration as low as 1 wt% Nylon-6 in 1,1,1,3,3,3-hexafluoro-2-propanol (HFIP). Wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC) results of the AFM electrospun fibers indicated that the nanofibers predominantly display the meta-stable γ crystalline form suggesting rapid crystallization rate during the process. In addition to precise control over fiber deposition and diameter, some of the drawbacks of conventional electrospinning such as large volume of solutions and clogging of needles can be overcome using this AFM based electrospinning technique. Lastly, a comparison of electrospun fibers from syringe-needle based electrospinning and AFM probe-tip based electrospinning indicated significant morphological and microstructural differences in the case of AFM based electrospinning.

  5. Role of geometry on the frequency spectra of U-shaped atomic force microscope probes

    NASA Astrophysics Data System (ADS)

    Rezaei, E.; Turner, J. A.

    2017-02-01

    Contact resonance atomic force microscopy (CR-AFM) is a specific technique that is used to determine elastic or viscoelastic properties of materials. The success of this technique is highly dependent on the accuracy of frequency spectra that must be measured for both noncontact and the case in which the tip is in contact with the sample of interest. Thus, choosing the right probe is crucial for accurate experiments. U-shaped probes also offer new opportunities for CR-AFM measurements because of certain specific modes that have tip motion parallel to the sample surface such that these resonances can access in-plane sample properties. However, analysis of the spectra from U-shaped probes is much more challenging due to these modes. The geometry of these probes is the main driver for the spectral response. Here, this influence on the resonance frequencies of the commercially fabricated U-shaped probe AN2-300 is evaluated with respect to geometry in terms of leg width, crossbeam width, and crossbeam length. Both noncontact and contact cases are examined with respect to variations of the nominal geometry. An energy distribution approach is also presented to assist with the identification of modes that have close resonances. Finally, this analysis allows recommendations to be made in order to minimize the convergence of multiple resonances for a specific range of measurement parameters.

  6. Microscopic observation of unworn siloxane-hydrogel soft contact lenses by atomic force microscopy.

    PubMed

    González-Méijome, José M; López-Alemany, Antonio; Almeida, José B; Parafita, Manuel A; Refojo, Miguel F

    2006-02-01

    In the present study, samples of lotrafilcon A, balafilcon A, and galyfilcon A contact lenses were observed by atomic force microscopy (AFM) in tapping mode at areas ranging from 0.25 to 400 microm2. Mean roughness (Ra), root-mean-square roughness (Rms) and maximum roughness (Rmax) in nanometers were obtained for the three lens materials at different magnifications. The three contact lenses showed significantly different surface topography. However, roughness values were dependent of the surface area to be analyzed. For a 1 microm2 area, statistics revealed a significantly more irregular surface of balafilcon A (Ra = 6.44 nm; Rms = 8.30 nm; Rmax = 96.82 nm) compared with lotrafilcon A (Ra = 2.40 nm; Rms = 3.19 nm; Rmax = 40.89 nm) and galyfilcon A (Ra = 1.40 nm; Rms = 1.79 nm; Rmax = 15.33 nm). Ra and Rms were the most consistent parameters, with Rmax presenting more variability for larger surface areas. The higher roughness of balafilcon A is attributed to the plasma oxidation treatment used to improve wettability. Conversely, galyfilcon A displays a smoother surface. Present observations could have implications in clinical aspects of siloxane-hydrogel contact lens wear such as lens spoliation, resistance to bacterial adhesion, or mechanical interaction with the ocular surface.

  7. Simultaneous scanning tunneling microscopy and stress measurements to elucidate the origins of surface forces.

    PubMed

    Narushima, Tetsuya; Kinahan, Niall T; Boland, John J

    2007-05-01

    We have developed a new combined measurement system to investigate the underlying origins of forces on solid state surfaces from the viewpoint of atomic surface morphology. This system consists of two main parts: the measurements of force based on displacements and detailed atomic resolution observations of the surface morphology. The former involves a large sample cantilever and a capacitive detection method that provide sufficient resolution to detect changes of a few meV/atom or pN/atom at surfaces. For the latter, a scanning tunneling microscope was incorporated to observe structural changes occurring on the surface of the cantilever sample. Although this combined observation is not trivial, it was accomplished by carefully designing sample dimensions while suppressing the self-oscillation of the cantilever. To demonstrate the performance of this system a preliminary study of the room temperature adsorption of Br(2) on the clean Si(111)-7x7 surface is presented.

  8. Efficacy of Light-Activated Sealant on Enamel Demineralization in Orthodontic Patients: An Atomic Force Microscope Evaluation

    PubMed Central

    Shinaishin, Suzi F; Ghobashy, Safaa A; EL-Bialy, Tarek H

    2011-01-01

    Objective: The purpose of this study was to investigate the efficacy of (Pro Seal) sealant in preventing enamel decalcification in-vivo and compare its effect with fluoride varnish and unfilled sealant using atomic force microscopy. Materials and Methods: Eight orthodontic patients who were candidates for extraction of all first premolars for orthodontic treatment were recruited to this study. Thirty two premolars (upper and lower) were randomly divided into four groups (n=8) for each group, 4 maxillary and 4 mandibular); Control (no -treatment); Fluoride varnish, Unfilled sealant (Light Bond) and filled sealant (Pro-Seal). After two months the brackets were debonded and the teeth were extracted and prepared for Atomic force microscopic scanning. Each sample was scanned twice at two different scan areas 50 and 10µm at the buccal cervical third of the crown. Images were recorded with slow scan rate and resolution and the mean roughness height and total surface area were calculated for each scan area. Comparison between groups was performed using one way analysis of variance test with level of significance was set to be 0.05. Results: Pro Seal treated samples show the lowest roughness height and total surface area. Conclusion: Pro Seal was the most effective prophylaxis technique in preventing enamel demineralization during orthodontic treatment. PMID:22207889

  9. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid.

    PubMed

    Akrami, Seyed Mohammad Reza; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-01

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ∼10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  10. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid

    SciTech Connect

    Reza Akrami, Seyed Mohammad; Miyata, Kazuki; Asakawa, Hitoshi; Fukuma, Takeshi

    2014-12-15

    High-speed atomic force microscopy has attracted much attention due to its unique capability of visualizing nanoscale dynamic processes at a solid/liquid interface. However, its usability and resolution have yet to be improved. As one of the solutions for this issue, here we present a design of a high-speed Z-tip scanner with screw holding mechanism. We perform detailed comparison between designs with different actuator size and screw arrangement by finite element analysis. Based on the design giving the best performance, we have developed a Z tip scanner and measured its performance. The measured frequency response of the scanner shows a flat response up to ∼10 kHz. This high frequency response allows us to achieve wideband tip-sample distance regulation. We demonstrate the applicability of the scanner to high-speed atomic-resolution imaging by visualizing atomic-scale calcite crystal dissolution process in water at 2 s/frame.

  11. High throughput reproducible cantilever functionalization

    SciTech Connect

    Evans, Barbara R; Lee, Ida

    2014-01-21

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  12. High throughout reproducible cantilever functionalization

    SciTech Connect

    Evans, Barbara R; Lee, Ida

    2014-11-25

    A method for functionalizing cantilevers is provided that includes providing a holder having a plurality of channels each having a width for accepting a cantilever probe and a plurality of probes. A plurality of cantilever probes are fastened to the plurality of channels of the holder by the spring clips. The wells of a well plate are filled with a functionalization solution, wherein adjacent wells in the well plate are separated by a dimension that is substantially equal to a dimension separating adjacent channels of the plurality of channels. Each cantilever probe that is fastened within the plurality of channels of the holder is applied to the functionalization solution that is contained in the wells of the well plate.

  13. The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes

    SciTech Connect

    Khare, H. S.; Burris, D. L.

    2013-05-15

    One of the major challenges in understanding and controlling friction is the difficulty in bridging the length and time scales of macroscale contacts and those of the single asperity interactions they comprise. While the atomic force microscope (AFM) offers a unique ability to probe tribological surfaces in a wear-free single-asperity contact, instrument calibration challenges have limited the usefulness of this technique for quantitative nanotribological studies. A number of lateral force calibration techniques have been proposed and used, but none has gained universal acceptance due to practical considerations, configuration limitations, or sensitivities to unknowable error sources. This paper describes a simple extension of the classic wedge method of AFM lateral force calibration which: (1) allows simultaneous calibration and measurement on any substrate, thus eliminating prior tip damage and confounding effects of instrument setup adjustments; (2) is insensitive to adhesion, PSD cross-talk, transducer/piezo-tube axis misalignment, and shear-center offset; (3) is applicable to integrated tips and colloidal probes; and (4) is generally applicable to any reciprocating friction coefficient measurement. The method was applied to AFM measurements of polished carbon (99.999% graphite) and single crystal MoS{sub 2} to demonstrate the technique. Carbon and single crystal MoS{sub 2} had friction coefficients of {mu}= 0.20 {+-} 0.04 and {mu}= 0.006 {+-} 0.001, respectively, against an integrated Si probe. Against a glass colloidal sphere, MoS{sub 2} had a friction coefficient of {mu}= 0.005 {+-} 0.001. Generally, the measurement uncertainties ranged from 10%-20% and were driven by the effect of actual frictional variation on the calibration rather than calibration error itself (i.e., due to misalignment, tip-offset, or probe radius).

  14. Nonlinear resonances of a single-wall carbon nanotube cantilever

    NASA Astrophysics Data System (ADS)

    Kim, I. K.; Lee, S. I.

    2015-03-01

    The dynamics of an electrostatically actuated carbon nanotube (CNT) cantilever are discussed by theoretical and numerical approaches. Electrostatic and intermolecular forces between the single-walled CNT and a graphene electrode are considered. The CNT cantilever is analyzed by the Euler-Bernoulli beam theory, including its geometric and inertial nonlinearities, and a one-mode projection based on the Galerkin approximation and numerical integration. Static pull-in and pull-out behaviors are adequately represented by an asymmetric two-well potential with the total potential energy consisting of the CNT elastic energy, electrostatic energy, and the Lennard-Jones potential energy. Nonlinear dynamics of the cantilever are simulated under DC and AC voltage excitations and examined in the frequency and time domains. Under AC-only excitation, a superharmonic resonance of order 2 occurs near half of the primary frequency. Under both DC and AC loads, the cantilever exhibits linear and nonlinear primary and secondary resonances depending on the strength of the excitation voltages. In addition, the cantilever has dynamic instabilities such as periodic or chaotic tapping motions, with a variation of excitation frequency at the resonance branches. High electrostatic excitation leads to complex nonlinear responses such as softening, multiple stability changes at saddle nodes, or period-doubling bifurcation points in the primary and secondary resonance branches.

  15. Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible 3He/10 T cryostat

    NASA Astrophysics Data System (ADS)

    von Allwörden, H.; Ruschmeier, K.; Köhler, A.; Eelbo, T.; Schwarz, A.; Wiesendanger, R.

    2016-07-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

  16. Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible (3)He/10 T cryostat.

    PubMed

    von Allwörden, H; Ruschmeier, K; Köhler, A; Eelbo, T; Schwarz, A; Wiesendanger, R

    2016-07-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped (3)He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

  17. A detailed guideline for the fabrication of single bacterial probes used for atomic force spectroscopy.

    PubMed

    Thewes, Nicolas; Loskill, Peter; Spengler, Christian; Hümbert, Sebastian; Bischoff, Markus; Jacobs, Karin

    2015-12-01

    The atomic force microscope (AFM) evolved as a standard device in modern microbiological research. However, its capability as a sophisticated force sensor is not used to its full capacity. The AFM turns into a unique tool for quantitative adhesion research in bacteriology by using "bacterial probes". Thereby, bacterial probes are AFM cantilevers that provide a single bacterium or a cluster of bacteria as the contact-forming object. We present a step-by-step protocol for preparing bacterial probes, performing force spectroscopy experiments and processing force spectroscopy data. Additionally, we provide a general insight into the field of bacterial cell force spectroscopy.

  18. Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance.

    PubMed

    Arima, Eiji; Naitoh, Yoshitaka; Li, Yan Jun; Yoshimura, Satoru; Saito, Hitoshi; Nomura, Hikaru; Nakatani, Ryoichi; Sugawara, Yasuhiro

    2015-03-27

    In magnetic force microscopy (MFM), the tip-sample distance should be reduced to analyze the microscopic magnetic domain structure with high spatial resolution. However, achieving a small tip-sample distance has been difficult because of superimposition of interaction forces such as van der Waals and electrostatic forces induced by the sample surface. In this study, we propose a new method of MFM using ferromagnetic resonance (FMR) to extract only the magnetic field near the sample surface. In this method, the magnetization of a magnetic cantilever is modulated by FMR to separate the magnetic field and topographic structure. We demonstrate the modulation of the magnetization of the cantilever and the identification of the polarities of a perpendicular magnetic medium.

  19. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    SciTech Connect

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; Lange, Dorus de; Sadeghian, Hamed E-mail: h.sadeghianmarnani@tudelft.nl

    2015-11-15

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  20. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points.

    PubMed

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; de Lange, Dorus; Sadeghian, Hamed

    2015-11-01

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of "light and stiff" and "static determinacy," the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  1. Exchange spring in A1/L1{sub 0} FePt composite and its application in magnetic force microscope

    SciTech Connect

    Li, Guoqing Zhu, Yanyan Zhang, Yong; Zhao, Hujun; Zeng, Daofu; Li, Yuhui; Lu, Wei

    2015-02-23

    This paper reported fabrication of Fe{sub x}Pt{sub 100-x} films with (001) epitaxy on MgO(100) substrates. The atomic percentage of Fe was changed within the range of x = 10–85 in order to search the optimal atomic ratio for achieving both high and isotropic-like coercivity. It was found that the Fe{sub 60}Pt{sub 40} film exhibited large coercivities exceeding 5 kOe along both in-plane and out-of-plane directions due to the formation of A1/L1{sub 0} FePt composite. A penta-domain model for hard/soft/hard exchange spring system was proposed to interpret the anomalous magnetization behaviors observed in Fe{sub 60}Pt{sub 40} sample. By using Fe{sub 60}Pt{sub 40} as the magnetic coating layer on a probe of magnetic force microscope, the flux changes at a linear density of 1000 kfci could be readily observed at a resolution of ∼13 nm.

  2. Multidomain piezo-ceramic cantilever

    NASA Astrophysics Data System (ADS)

    Sedorook, David P.

    PZT-5H is a ferroelectric and piezoelectric material that has many applications that are the subjects of current research. As a ferroelectric, PZT-5H has a permanent electrical polarization that arises from ferroelectric domains. In this thesis, numerical simulations were conducted via the well know Finite Element Method of several types of piezoelectric cantilevers that were made of PIC-181, a high quality PZT-5H made in Germany. Single crystal cantilever models with multiple polarization vectors were investigated with Q factors ranging from Q = 50 to Q = 1200, where the acoustical displacements were calculated. Further, the displacements were calculated for a multidomain cantilever model with inversely poled domains and uniform electrode configuration as well as a single crystal cantilever model with uniformly poled crystal and bipolar electrode configuration. It was shown that cantilevers that are less oblong in shape could benefit from the bipolar electrode configuration in applications where size may be an important parameter, for instance in small flying robotic insects. From the experimental measurements of the resonance and anti-resonance frequencies in various PIC-181 samples, the radial and longitudinal components of speed of sound in material were calculated. Experimental results of longitudinal speed of sound differed from the accepted value of 4.6 km/s by 1.6 % error.

  3. Comparison of the ability of quantitative parameters to differentiate surface texture of Atomic Force Microscope (AFM) images

    NASA Astrophysics Data System (ADS)

    Niedzielski, Bethany; Caragianis Broadbridge, Christine; DaPonte, John S.; Gherasimova, Maria

    2010-01-01

    The purpose of this study was to compare the ability of several texture analysis parameters to differentiate textured samples from a smooth control on images obtained with an Atomic Force Microscope (AFM). Surface roughness plays a major role in the realm of material science, especially in integrated electronic devices. As these devices become smaller and smaller, new materials with better electrical properties are needed. New materials with smoother surface morphology have been found to have superior electrical properties than their rougher counterparts. Therefore, in many cases surface texture is indicative of the electrical properties that material will have. Physical vapor deposition techniques such as Jet Vapor Deposition and Molecular Beam Epitaxy are being utilized to synthesize these materials as they have been found to create pure and uniform thin layers. For the current study, growth parameters were varied to produce a spectrum of textured samples. The focus of this study was the image processing techniques associated with quantifying surface texture. As a result of the limited sample size, there was no attempt to draw conclusions about specimen processing methods. The samples were imaged using an AFM in tapping mode. In the process of collecting images, it was discovered that roughness data was much better depicted in the microscope's "height" mode as opposed to "equal area" mode. The AFM quantified the surface texture of each image by returning RMS roughness and the first order histogram statistics of mean roughness, standard deviation, skewness, and kurtosis. Color images from the AFM were then processed on an off line computer running NIH ImageJ with an image texture plug in. This plug in produced another set of first order statistics computed from each images' histogram as well as second order statistics computed from each images' cooccurrence matrix. The second order statistics, which were originally proposed by Haralick, include contrast, angular

  4. Decoupled cantilever arms for highly versatile and sensitive temperature and heat flux measurements

    NASA Astrophysics Data System (ADS)

    Burg, Brian R.; Tong, Jonathan K.; Hsu, Wei-Chun; Chen, Gang

    2012-10-01

    Microfabricated cantilever beams have been used in microelectromechanical systems for a variety of sensor and actuator applications. Bimorph cantilevers accurately measure temperature change and heat flux with resolutions several orders of magnitude higher than those of conventional sensors such as thermocouples, semiconductor diodes, as well as resistance and infrared thermometers. The use of traditional cantilevers, however, entails a series of important measurement limitations, because their interactions with the sample and surroundings often create parasitic deflection forces and the typical metal layer degrades the thermal sensitivity of the cantilever. The paper introduces a design to address these issues by decoupling the sample and detector section of the cantilever, along with a thermomechanical model, the fabrication, system integration, and characterization. The custom-designed bi-arm cantilever is over one order of magnitude more sensitive than current commercial cantilevers due to the significantly reduced thermal conductance of the cantilever sample arm. The rigid and immobile sample section offers measurement versatility ranging from photothermal absorption, near-field thermal radiation down to contact, conduction, and material thermal characterization measurements in nearly identical configurations.

  5. SiC-Based Miniature High-Temperature Cantilever Anemometer

    NASA Technical Reports Server (NTRS)

    Okojie, Robert S.; Fralick, Gustave; Saad, George J.

    2004-01-01

    . The top clamping plate is brought into contact with the bottom plate so that the narrow section of the metal strips on the top clamp plate aligns with the metal contact pads on the cantilever. When the parts are clamped together, the metal strips provide electrical connections between the Wheatstone-bridge contact points and the sides the trenches that constitute the socket for the multipin electrical plug. Hence, to connect the Wheatstone bridge to external circuitry for processing of the anemometer readout, one need only insert the plug in the socket. In operation, the cantilever end of the stainless-steel housing is mounted flush with an engine wall and the unclamped portion of the cantilever is exposed into the flow. The cantilever is deflected in direct proportion to the force induced by component of flow parallel to the engine wall and perpendicular to the broad exposed face of the cantilever. The maximum strain on the cantilever occurs at the clamped edge and is measured by the piezoresistors, which are located there. The corresponding changes in resistance manifest themselves in the output of the Wheatstone bridge.

  6. Constant tip-surface distance with atomic force microscopy via quality factor feedback

    NASA Astrophysics Data System (ADS)

    Fan, Lin; Potter, Daniel; Sulchek, Todd

    2012-02-01

    The atomic force microscope (AFM) is a powerful and widely used instrument to image topography and measure forces at the micrometer and nanometer length scale. Because of the high degree of operating accuracy required of the instrument, small thermal and mechanical drifts of the cantilever and piezoactuator systems hamper measurements as the AFM tip drifts spatially relative to the sample surface. To compensate for the drift, we control the tip-surface distance by monitoring the cantilever quality factor (Q) in a closed loop. Brownian thermal fluctuations provide sufficient actuation to accurately determine cantilever Q by fitting the thermal noise spectrum to a Lorentzian function. We show that the cantilever damping is sufficiently affected by the tip-surface distance so that the tip position of soft cantilevers can be maintained within 40 nm of a setpoint in air and within 3 nm in water with 95% reliability. Utilizing this method to hover the tip above a sample surface, we have the capability to study sensitive interactions at the nanometer length scale over long periods of time.

  7. High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller.

    PubMed

    Habibullah, H; Pota, H R; Petersen, I R

    2014-03-01

    This paper demonstrates a high-speed spiral imaging technique for an atomic force microscope (AFM). As an alternative to traditional raster scanning, an approach of gradient pulsing using a spiral line is implemented and spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes to the X and Y-axes of the AFM's piezoelectric tube scanner (PTS). Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian controller is designed to track the reference sinusoid and a vibration compensator is combined to damp the resonant mode of the PTS. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoids from the X and Y-PTSs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. As part of the post-processing of the experimental data, a fifth-order Butterworth filter is used to filter noises in the signals emanating from the position sensors and a Gaussian image filter is used to filter the images. A comparison of images scanned using the proposed controller (spiral) and the AFM PI controller (raster) shows improvement in the scanning rate using the proposed method.

  8. Remote atomic force microscopy of microscopic organisms: Technological innovations for hands-on science with middle and high school students

    NASA Astrophysics Data System (ADS)

    Jones, M. G.; Andre, T.; Kubasko, D.; Bokinsky, A.; Tretter, T.; Negishi, A.; Taylor, R.; Superfine, R.

    2004-01-01

    This study examined hands-on experiences in the context of an investigation of viruses and explored how and why hands-on experiences may be effective. We sought to understand whether or not touching and manipulating materials and objects could lead to a deeper, more effective type of knowing than that we obtain from sight or sound alone. Four classes of high school biology students and four classes of seventh graders participated in the study that examined students' use of remote microscopy with a new scientific tool called the nanoManipulator, which enabled them to reach out and touch live viruses inside an atomic force microscope. Half of the students received full haptic (tactile and kinesthetic) feedback from a haptic joystick, whereas half of the students were able to use the haptic joystick to manipulate viruses but the tactile feedback was blocked. Results showed that there were significant gains from pre- to postinstruction across treatment groups for knowledge and attitudes. Students in both treatment groups developed conceptual models of viruses that were more consistent with current scientific research, including a move from a two-dimensional to a three-dimensional understanding of virus morphology. There were significant changes in students' understandings of scale; after instruction, students were more likely to identify examples of nanosized objects and be able to describe the degree to which a human would have to be shrunk to reach the size of a virus. Students who received full-haptic feedback had significantly better attitudes suggesting that the increased sensory feedback and stimulation may have made the experience more engaging and motivating to students.

  9. Electrical conductivity in Langmuir-Blodgett films of n-alkyl cyanobiphenyls using current sensing atomic force microscope

    SciTech Connect

    Gayathri, H. N.; Suresh, K. A.

    2015-06-28

    We report our studies on the nanoscale electrical conductivity in monolayers of n-alkyl cyanobiphenyl materials deposited on solid surface. Initially, the 8CB, 9CB, and 10CB monolayer films were prepared by the Langmuir technique at air-water interface and characterized by surface manometry and Brewster angle microscopy. The monolayer films were transferred on to solid substrates by the Langmuir-Blodgett (L-B) technique. The 8CB, 9CB, and 10CB monolayer L-B films were deposited on freshly cleaved mica and studied by atomic force microscope (AFM), thereby measuring the film thickness as ∼1.5 nm. The electrical conductivity measurements were carried out on 9CB and 10CB monolayer L-B films deposited onto highly ordered pyrolytic graphite using current sensing AFM. The nanoscale current-voltage (I-V) measurements show a non-linear variation. The nature of the curve indicates electron tunneling to be the mechanism for electrical conduction. Furthermore, analysis of the I-V curve reveals a transition in the electron conduction mechanism from direct tunneling to injection tunneling. From the transition voltage, we have estimated the values of barrier height for 9CB and 10CB to be 0.71 eV and 0.37 eV, respectively. For both 9CB and 10CB, the effective mass of electron was calculated to be 0.021 m{sub e} and 0.065 m{sub e}, respectively. These parameters are important in the design of molecular electronic devices.

  10. Atomic force microscopy of biological samples.

    PubMed

    Allison, David P; Mortensen, Ninell P; Sullivan, Claretta J; Doktycz, Mitchel J

    2010-01-01

    The ability to evaluate structural-functional relationships in real time has allowed scanning probe microscopy (SPM) to assume a prominent role in post genomic biological research. In this mini-review, we highlight the development of imaging and ancillary techniques that have allowed SPM to permeate many key areas of contemporary research. We begin by examining the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 and discuss how it served to team biologists with physicists to integrate high-resolution microscopy into biological science. We point to the problems of imaging nonconductive biological samples with the STM and relate how this led to the evolution of the atomic force microscope (AFM) developed by Binnig, Quate, and Gerber, in 1986. Commercialization in the late 1980s established SPM as a powerful research tool in the biological research community. Contact mode AFM imaging was soon complemented by the development of non-contact imaging modes. These non-contact modes eventually became the primary focus for further new applications including the development of fast scanning methods. The extreme sensitivity of the AFM cantilever was recognized and has been developed into applications for measuring forces required for indenting biological surfaces and breaking bonds between biomolecules. Further functional augmentation to the cantilever tip allowed development of new and emerging techniques including scanning ion-conductance microscopy (SICM), scanning electrochemical microscope (SECM), Kelvin force microscopy (KFM) and scanning near field ultrasonic holography (SNFUH).

  11. Atomic force microscopy of biological samples

    SciTech Connect

    Doktycz, Mitchel John

    2010-01-01

    The ability to evaluate structural-functional relationships in real time has allowed scanning probe microscopy (SPM) to assume a prominent role in post genomic biological research. In this mini-review, we highlight the development of imaging and ancillary techniques that have allowed SPM to permeate many key areas of contemporary research. We begin by examining the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 and discuss how it served to team biologists with physicists to integrate high-resolution microscopy into biological science. We point to the problems of imaging nonconductive biological samples with the STM and relate how this led to the evolution of the atomic force microscope (AFM) developed by Binnig, Quate, and Gerber, in 1986. Commercialization in the late 1980s established SPM as a powerful research tool in the biological research community. Contact mode AFM imaging was soon complemented by the development of non-contact imaging modes. These non-contact modes eventually became the primary focus for further new applications including the development of fast scanning methods. The extreme sensitivity of the AFM cantilever was recognized and has been developed into applications for measuring forces required for indenting biological surfaces and breaking bonds between biomolecules. Further functional augmentation to the cantilever tip allowed development of new and emerging techniques including scanning ion-conductance microscopy (SICM), scanning electrochemical microscope (SECM), Kelvin force microscopy (KFM) and scanning near field ultrasonic holography (SNFUH).

  12. Excited-state spectroscopy on an individual quantum dot using atomic force microscopy.

    PubMed

    Cockins, Lynda; Miyahara, Yoichi; Bennett, Steven D; Clerk, Aashish A; Grutter, Peter

    2012-02-08

    We present a new charge sensing technique for the excited-state spectroscopy of individual quantum dots, which requires no patterned electrodes. An oscillating atomic force microscope cantilever is used as a movable charge sensor as well as gate to measure the single-electron tunneling between an individual self-assembled InAs quantum dot and back electrode. A set of cantilever dissipation versus bias voltage curves measured at different cantilever oscillation amplitudes forms a diagram analogous to the Coulomb diamond usually measured with transport measurements. The excited-state levels as well as the electron addition spectrum can be obtained from the diagram. In addition, a signature which can result from inelastic tunneling by phonon emission or a peak in the density of states of the electrode is also observed, which demonstrates the versatility of the technique.

  13. bOptimizing atomic force microscopy for characterization of diamond-protein interfaces

    PubMed Central

    2011-01-01

    Atomic force microscopy (AFM) in contact mode and tapping mode is employed for high resolution studies of soft organic molecules (fetal bovine serum proteins) on hard inorganic diamond substrates in solution and air. Various effects in morphology and phase measurements related to the cantilever spring constant, amplitude of tip oscillations, surface approach, tip shape and condition are demonstrated and discussed based on the proposed schematic models. We show that both diamond and proteins can be mechanically modified by Si AFM cantilever. We propose how to choose suitable cantilever type, optimize scanning parameters, recognize and minimize various artifacts, and obtain reliable AFM data both in solution and in air to reveal microscopic characteristics of protein-diamond interfaces. We also suggest that monocrystalline diamond is well defined substrate that can be applicable for fundamental studies of molecules on surfaces in general. PMID:21711846

  14. Fountain pen nanochemistry: Atomic force control of chrome etching

    NASA Astrophysics Data System (ADS)

    Lewis, Aaron; Kheifetz, Yuri; Shambrodt, Efim; Radko, Anna; Khatchatryan, Edward; Sukenik, Chaim

    1999-10-01

    In this report we demonstrate a general method for affecting chemical reactions with a high degree of spatial control that has potentially wide applicability in science and technology. Our technique is based on complexing the delivery of liquid or gaseous materials through a cantilevered micropipette with an atomic force microscope that is totally integrated into a conventional optical microscope. Controlled etching of chrome is demonstrated without detectable effects on the underlying glass substrate. This simple combination allows for the nanometric spatial control of the whole world of chemical reactions in defined regions of surfaces. Applications of the technique in critical areas such as mask repair are likely.

  15. Optical racetrack resonator transduction of nanomechanical cantilevers.

    PubMed

    Sauer, V T K; Diao, Z; Freeman, M R; Hiebert, W K

    2014-02-07

    Optomechanical transduction has demonstrated its supremacy in probing nanomechanical displacements. In order to apply nano-optomechanical systems (NOMS) as force and mass sensors, knowledge about the transduction responsivity (i.e. the change in measured optical transmission with nanomechanical displacement) and its tradeoffs with system design is paramount. We compare the measured responsivities of NOMS devices with varying length, optomechanical coupling strength gom, and optical cavity properties. Cantilever beams 1.5 to 5 μm long are fabricated 70 to 160 nm from a racetrack resonator optical cavity and their thermomechanical (TM) noise signals are measured. We derive a generic expression for the transduction responsivity of the NOMS in terms of optical and mechanical system parameters such as finesse, optomechanical coupling constant, and interaction length. The form of the expression holds direct insight as to how these parameters affect the responsivity. With this expression, we obtain the optomechanical coupling constants using only measurements of the TM noise power spectra and optical cavity transmission slopes. All optical pump/probe operation is also demonstrated in our side-coupled cantilever-racetrack NOMS. Finally, to assess potential operation in a gas sensing environment, the TM noise signal of a device is measured at atmospheric pressure.

  16. Reduced hydrophobic interaction of polystyrene surfaces by spontaneous segregation of block copolymers with oligo (ethylene glycol) methyl ether methacrylate blocks: force measurements in water using atomic force microscope with hydrophobic probes.

    PubMed

    Zhang, Rui; Seki, Akiko; Ishizone, Takashi; Yokoyama, Hideaki

    2008-05-20

    Reduction of hydrophobic interaction in water is important in biological interfaces. In our previous work, we have found that poly(styrene- b-triethylene glycol methyl ether methacrylate) (PS-PME3MA) segregates the PME3MA block to the surface in hydrophobic environment, such as in air or in a vacuum, and shows remarkable resistance against adsorption or adhesion of proteins, platelets, and cells in water. In this paper, we report that atomic force microscopy (AFM) with hydrophobic probes can directly monitor the reduced hydrophobic interaction of the PS surfaces modified by poly(styrene- b-origoethylene glycol methyl ether methacrylate) (PS-PME NMA), where N is the number of ethylene glycol units. The pull-off forces between the hydrophobic probes that are coated with octyltrichlorosilane (OLTS) and the PS-PME NMA modified polystyrene (PS) surfaces in water were measured. The absolute spring constants and tip-curvatures of the AFM cantilevers were measured to compute the work of adhesion by the Johnson, Kendall, and Roberts (JKR) theory, which relates the pull-off force at which the separation occurs between a hemisphere and a plane to the work of adhesion. The hydrophobic interactions between the hydrophobic tip and polymer surfaces in water were greatly reduced with the segregated PME NMA blocks. The hydrophobic interactions decrease with increasing N of the series of PS-PME NMA and show a correlation with the amount of protein adsorbed.

  17. Experimental determination of the spring constant of an individual multiwalled carbon nanotube cantilever using fluorescence measurement

    NASA Astrophysics Data System (ADS)

    Kwon, Soongeun; Park, Hyojun; Shim, Hyung Cheoul; Lee, Hyung Woo; Kwak, Yoon Keun; Kim, Soohyun

    2009-07-01

    We report an experimental method to determine the spring constant of a multiwalled carbon nanotube (MWNT) cantilever as a mechanical piconewton force transducer. Electrostatic actuation was employed to investigate the mechanical properties of a MWNT cantilever. In order to measure nanotube's deflection during actuation, fluorescent dyes were noncovalently attached to the end of the nanotubes. Also, the length dependence of the spring constant is studied by adjusting the length of MWNT via electrochemical etching. The results show that the spring constant of a MWNT cantilever is as small as 0.001 N/m and tunable in the range of 0.001-0.05 N/m.

  18. Study of the sensitivity and resonant frequency of the torsional modes of an AFM cantilever with a sidewall probe based on a nonlocal elasticity theory.

    PubMed

    Abbasi, Mohammad; Karami Mohammadi, Ardeshir

    2015-05-01

    A relationship based on a nonlocal elasticity theory is developed to investigate the torsional sensitivity and resonant frequency of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever and a vertical extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidewalls of microstructures. First, the governing differential equations of motion and boundary conditions for dynamic analysis are obtained by a combination of the basic equations of nonlocal elasticity theory and Hamilton's principle. Afterward, a closed-form expression for the sensitivity of vibration modes has been obtained using the relationship between the resonant frequency and contact stiffness of cantilever and sample. These analysis accounts for a better representation of the torsional behavior of an AFM with sidewall probe where the small-scale effect are significant. The results of the proposed model are compared with those of classical beam theory. The results show that the sensitivities and resonant frequencies of ACP predicted by the nonlocal elasticity theory are smaller than those obtained by the classical beam theory.

  19. Hydrodynamic force depends not only on the viscosity of solution but also on the molecular weights of viscogens.

    PubMed

    Lv, Chunmei; Zou, Dawei; Qin, Meng; Meng, Wei; Cao, Yi; Wang, Wei

    2013-08-27

    Many cellular processes, such as the diffusion of biomacromolecules, the movement of molecular motors, and the conformational dynamics of proteins, are subjected to hydrodynamic forces because of the high viscosities of cellular environments. However, it is still unknown how hydrodynamic forces are related to the physical properties of different viscogens. Here, using the atomic force microscope-based force spectroscopy technique, we directly measured the hydrodynamic forces acting on a moving cantilever in various viscogen solutions. We found that the hydrodynamic force is not only dependent on the viscosity but also related to the molecular weight of viscogens. Counterintuitively, at the same macroscopic viscosity, the hydrodynamic force rises with the increasing molecular weight of viscogens, although the local microscopic viscosity of the solution decreases. This finding provides insights into the origin of hydrodynamic forces in biomolecule solutions and could inspire many force-spectroscopy-based techniques to measure the molecular weight and conformational changes of biomacromolecules in biological settings directly.

  20. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study.

    PubMed

    Campbellová, Anna; Ondráček, Martin; Pou, Pablo; Pérez, Rubén; Klapetek, Petr; Jelínek, Pavel

    2011-07-22

    A Si adatom on a Si(111)-(7 × 7) reconstructed surface is a typical atomic feature that can rather easily be imaged by a non-contact atomic force microscope (nc-AFM) and can be thus used to test the atomic resolution of the microscope. Based on our first principles density functional theory (DFT) calculations, we demonstrate that the structure of the termination of the AFM tip plays a decisive role in determining the appearance of the adatom image. We show how the AFM image changes depending on the tip-surface distance and the composition of the atomic apex at the end of the tip. We also demonstrate that contaminated tips may give rise to image patterns displaying so-called 'sub-atomic' features even in the attractive force regime.

  1. Compact metal probes: a solution for atomic force microscopy based tip-enhanced Raman spectroscopy.

    PubMed

    Rodriguez, R D; Sheremet, E; Müller, S; Gordan, O D; Villabona, A; Schulze, S; Hietschold, M; Zahn, D R T

    2012-12-01

    There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.

  2. Cantilevered probe detector with piezoelectric element

    SciTech Connect

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2014-04-29

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  3. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2010-04-06

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  4. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2013-04-30

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  5. Cantilevered probe detector with piezoelectric element

    DOEpatents

    Adams, Jesse D [Reno, NV; Sulchek, Todd A [Oakland, CA; Feigin, Stuart C [Reno, NV

    2012-07-10

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  6. Cantilever spring constant calibration using laser Doppler vibrometry

    SciTech Connect

    Ohler, Benjamin

    2007-06-15

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.

  7. Cantilever spring constant calibration using laser Doppler vibrometry.

    PubMed

    Ohler, Benjamin

    2007-06-01

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as uncertainties in their experimental implementation. Here we report the results from two of the most common calibration methods, the thermal tune method and the Sader method. These were implemented on a standard AFM system as well as using laser Doppler vibrometry (LDV). Using LDV eliminates some uncertainties associated with optical lever detection on an AFM. It also offers considerably higher signal to noise deflection measurements. We find that AFM and LDV result in similar uncertainty in the calibrated spring constants, about 5%, using either the thermal tune or Sader methods provided that certain limitations of the methods and instrumentation are observed.

  8. Parameters affecting the adhesion strength between a living cell and a colloid probe when measured by the atomic force microscope.

    PubMed

    McNamee, Cathy E; Pyo, Nayoung; Tanaka, Saaya; Vakarelski, Ivan U; Kanda, Yoichi; Higashitani, Ko

    2006-03-15

    In this study, we used the colloid probe atomic force microscopy (AFM) technique to investigate the adhesion force between a living cell and a silica colloid particle in a Leibovitz's L-15 medium (L-15). The L-15 liquid maintained the pharmaceutical conditions necessary to keep the cells alive in the outside environment during the AFM experiment. The force curves in such a system showed a steric repulsion in the compression force curve, due to the compression of the cells by the colloid probe, and an adhesion force in the decompression force curve, due to binding events between the cell and the probe. We also investigated for the first time how the position on the cell surface, the strength of the pushing force, and the residence time of the probe at the cell surface individually affected the adhesion force between a living cell and a 6.84 microm diameter silica colloid particle in L-15. The position of measuring the force on the cell surface was seen not to affect the value of the maximum adhesion force. The loading force was also seen not to notably affect the value of the maximum adhesion force, if it was small enough not to pierce and damage the cell. The residence time of the probe at the cell surface, however, clearly affected the adhesion force, where a longer residence time gave a larger maximum force. From these results, we could conclude that the AFM force measurements should be made using a loading force small enough not to damage the cell and a fixed residence time, when comparing results of different systems.

  9. Apertureless cantilever-free pen arrays for scanning photochemical printing.

    PubMed

    Zhou, Yu; Xie, Zhuang; Brown, Keith A; Park, Daniel J; Zhou, Xiaozhu; Chen, Peng-Cheng; Hirtz, Michael; Lin, Qing-Yuan; Dravid, Vinayak P; Schatz, George C; Zheng, Zijian; Mirkin, Chad A

    2015-02-25

    A novel, apertureless, cantilever-free pen array can be used for dual scanning photochemical and molecular printing. Serial writing with light is enabled by combining self-focusing pyramidal pens with an opaque backing between pens. The elastomeric pens also afford force-tuned illumination and simultaneous delivery of materials and optical energy. These attributes make the technique a promising candidate for maskless high-resolution photopatterning and combinatorial chemistry.

  10. Atomic Force Microscopy on Its Way to Adolescence

    NASA Astrophysics Data System (ADS)

    Giessibl, Franz J.

    2003-12-01

    When the atomic force microscope (AFM) was introduced in 1986, its potential to resolve surfaces with true atomic resolution was already proposed. However, substantial problems had to be overcome before atomic resolution became possible by AFM. Today, true atomic resolution by AFM is standard practice. This article discusses the influence of the cantilever stiffness and — amplitude on noise and short-range force sensitivity and introduces a sensor operating at near optimal conditions (qPlus sensor). The data achieved with this optimized sensing technology show substructures within single atom images, attributed to atomic orbitals.

  11. A hybrid high-speed atomic force-optical microscope for visualizing single membrane proteins on eukaryotic cells

    NASA Astrophysics Data System (ADS)

    Colom, Adai; Casuso, Ignacio; Rico, Felix; Scheuring, Simon

    2013-07-01

    High-speed atomic force microscopy is a powerful tool for studying structure and dynamics of proteins. So far, however, high-speed atomic force microscopy was restricted to well-controlled molecular systems of purified proteins. Here we integrate an optical microscopy path into high-speed atomic force microscopy, allowing bright field and fluorescence microscopy, without loss of high-speed atomic force microscopy performance. This hybrid high-speed atomic force microscopy/optical microscopy setup allows positioning of the high-speed atomic force microscopy tip with high spatial precision on an optically identified zone of interest on cells. We present movies at 960 ms per frame displaying aquaporin-0 array and single molecule dynamics in the plasma membrane of intact eye lens cells. This hybrid setup allows high-speed atomic force microscopy imaging on cells about 1,000 times faster than conventional atomic force microscopy/optical microscopy setups, and allows first time visualization of unlabelled membrane proteins on a eukaryotic cell under physiological conditions. This development advances high-speed atomic force microscopy from molecular to cell biology to analyse cellular processes at the membrane such as signalling, infection, transport and diffusion.

  12. Electromechanical properties of single-walled carbon nanotube devices on micromachined cantilevers

    NASA Astrophysics Data System (ADS)

    Jeon, Eun-Kyoung; Park, Chan-Hyun; Lee, Jung A.; Kim, Min-Seok; Lee, Kwang-Cheol; So, Hye-Mi; Ahn, Chiwon; Chang, Hyunju; Kong, Ki-jeong; Kim, Ju-Jin; Lee, Jeong-O.

    2012-11-01

    We have investigated the electromechanical properties of single-walled carbon nanotubes (SWNTs) by constructing carbon nanotube transistors on micro-cantilevers. SWNTs and ultra-long carbon nanotubes (UNTs) were grown on free-standing Si3N4 membranes by using chemical vapor deposition, and electrical contacts were generated with electron beam lithography and lift-off. The cantilevers bearing SWNT devices were micromachined so that hybrid cantilevers with various spring constants were fabricated. To measure the electromechanical properties of the SWNTs, precisely controlled forces were generated by a microbalance and applied to the hybrid cantilever devices. Upon bending, the conductances of the metallic and large-gap semiconducting UNTs showed no notable change, whereas the conductances of the small-gap semiconducting UNTs and networks of SWNTs increased. Numerical simulations of bended SWNT made using a multiscale simulator supported the hypothesis that the small-gap semiconducting SWNTs undergo a metallic transformation upon bending.

  13. Use of self-actuating and self-sensing cantilevers for imaging biological samples in fluid

    PubMed Central

    Barbero, R J; Deutschinger, A; Todorov, V; Gray, D S; Belcher, A M; Rangelow, I W; Youcef-Toumi, K

    2014-01-01

    In this paper, we present a detailed investigation into the suitability of atomic force microscopy (AFM) cantilevers with integrated deflection sensor and micro-actuator for imaging of soft biological samples in fluid. The Si cantilevers are actuated using a micro-heater at the bottom end of the cantilever. Sensing is achieved through p-doped resistors connected in a Wheatstone bridge. We investigated the influence of the water on the cantilever dynamics, the actuation and the sensing mechanisms, as well as the crosstalk between sensing and actuation. Successful imaging of yeast cells in water using the integrated sensor and actuator shows the potential of the combination of this actuation and sensing method. This constitutes a major step towards the automation and miniaturization required to establish AFM in routine biomedical diagnostics and in vivo applications. PMID:19801750

  14. Laser controlled coupled cantilevers for precise measurements and energy transfer (Conference Presentation)

    NASA Astrophysics Data System (ADS)

    Cao, Gengyu

    2016-09-01

    Coupled cantilevers are trapped by laser in a 3-mirror configuration. We studied the signal transduction between the cantilevers by laser control. A force or displacement sensor with such laser trapping technique could achieve much higher sensitivity, as high as 3-4 orders as compared to a single cantilever. We also studied the energy transfer processes by laser trapping and manipulation. Rabi oscillations are observed. Quantum analog Landau-Zener Tunneling and Landau-Zener-Stuckelburg interferometry are realized in the classical regime. We have proved that the energy or signals could be transferred from one cantilever to the other in the real-space by laser manipulation. Laser manipulated coupled cantilvers have great potentials in precision measurements and in quantum information processing.

  15. Interaction imaging with amplitude-dependence force spectroscopy.

    PubMed

    Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A; Haviland, David B

    2013-01-01

    Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic AFM has been enormously successful in imaging surface topography, even to atomic resolution, but the force between the AFM tip and the surface remains unknown during imaging. Here we present a new approach that combines high-accuracy force measurements and high-resolution scanning. The method, called amplitude-dependence force spectroscopy (ADFS), is based on the amplitude dependence of the cantilever's response near resonance and allows for separate determination of both conservative and dissipative tip-surface interactions. We use ADFS to quantitatively study and map the nano-mechanical interaction between the AFM tip and heterogeneous polymer surfaces. ADFS is compatible with commercial atomic force microscopes and we anticipate its widespread use in taking AFM toward quantitative microscopy.

  16. The relationship between local liquid density and force applied on a tip of atomic force microscope: A theoretical analysis for simple liquids

    SciTech Connect

    Amano, Ken-ichi Takahashi, Ohgi; Suzuki, Kazuhiro; Fukuma, Takeshi; Onishi, Hiroshi

    2013-12-14

    The density of a liquid is not uniform when placed on a solid. The structured liquid pushes or pulls a probe employed in atomic force microscopy, as demonstrated in a number of experimental studies. In the present study, the relation between the force on a probe and the local density of a liquid is derived based on the statistical mechanics of simple liquids. When the probe is identical to a solvent molecule, the strength of the force is shown to be proportional to the vertical gradient of ln(ρ{sub DS}) with the local liquid's density on a solid surface being ρ{sub DS}. The intrinsic liquid's density on a solid is numerically calculated and compared with the density reconstructed from the force on a probe that is identical or not identical to the solvent molecule.

  17. Effect of the interaction conditions of the probe of an atomic-force microscope with the n-GaAs surface on the triboelectrization phenomenon

    SciTech Connect

    Baklanov, A. V.; Gutkin, A. A.; Kalyuzhnyy, N. A.; Brunkov, P. N.

    2015-08-15

    Triboelectrization as a result of the scanning of an atomic-force-microscope probe over an n-GaAs surface in the contact mode is investigated. The dependences of the local potential variation on the scanning rate and the pressing force of the probe are obtained. The results are explained by point-defect formation in the surface layers of samples under the effect of deformation of these layers during probe scanning. The charge localized at these defects in the case of equilibrium changes the potential of surface, which is subject to triboelectrization. It is shown that, for qualitative explanation of the observed dependences, it is necessary to take into account both the generation and annihilation of defects in the region experiencing deformation.

  18. Adhesive force mapping of friction-transferred PTFE film surface

    NASA Astrophysics Data System (ADS)

    Suzuki, H.; Mashiko, S.

    The adhesive force of a friction-transferred polytetrafluoroethylene (PTFE) film was mapped by using an atomic force microscope (AFM) system driven by custom software. The friction-transferred PTFE film, which was made by sliding a PTFE polymer rod on a heated glass, consisted of many PTFE ridges running parallel to the sliding direction on the glass surface. The adhesive force on the sample was derived from force curve measurement. A triangular wave amplified with a custom high-voltage amplifier was fed into the Z piezo of the AFM head through an AFM controller unit to obtain force curves while the AFM cantilever scanned a single line of the sample. The force curves both of the PTFE ridges and of the bare glass surface could be obtained by scanning the region perpendicular to the sliding direction. The deflection signal of the cantilever was sampled and stored in a computer through an AD converter. The adhesive force on the PTFE region was about half that on the glass surface. This difference was explained by the difference in capillary force of the surface water.

  19. Tuning the instability in static mode atomic force spectroscopy as obtained in an AFM by applying an electric field between the tip and the substrate.

    PubMed

    Biswas, Soma; Raychaudhuri, A K; Sreeram, P A; Dietzel, Dirk

    2012-11-01

    We have investigated experimentally the role of cantilever instabilities in determination of the static mode force-distance curves in presence of a dc electric field. The electric field has been applied between the tip and the sample in an atomic force microscope working in ultra-high vacuum. We have shown how an electric field modifies the observed force (or cantilever deflection)-vs-distance curves, commonly referred to as the static mode force spectroscopy curves, taken using an atomic force microscope. The electric field induced instabilities shift the jump-into-contact and jump-off-contact points and also the deflection at these instability points. We explained the experimental results using a model of the tip-sample interaction and quantitatively established a relation between the observed static mode force spectroscopy curves and the applied electric field which modifies the effective tip-sample interaction in a controlled manner. The investigation establishes a way to quantitatively evaluate the electrostatic force in an atomic force microscope using the static mode force spectroscopy curves.

  20. Comparing AFM cantilever stiffness measured using the thermal vibration and the improved thermal vibration methods with that of an SI traceable method based on MEMS

    NASA Astrophysics Data System (ADS)

    Brand, Uwe; Gao, Sai; Engl, Wolfgang; Sulzbach, Thomas; Stahl, Stefan W.; Milles, Lukas F.; Nesterov, Vladimir; Li, Zhi

    2017-03-01

    PTB has developed a new contact based method for the traceable calibration of the normal stiffness of AFM cantilevers in the range from 0.03 N m‑1 to 300 N m‑1 to the SI units based on micro-electro-mechanical system (MEMS) actuators. This method is evaluated by comparing the measured cantilever stiffness with that measured by PTB’s new primary nanonewton force facility and by PTB’s microforce measuring device. The MEMS system was used to calibrate the stiffness of cantilevers in two case studies. One set of cantilevers for applications in biophysics was calibrated using the well-known thermal vibration method and the second set of cantilevers was calibrated by a cantilever manufacturer who applied an improved thermal vibration method based on calibrated reference cantilevers for the cantilever stiffness calibration. The comparison revealed a stiffness deviation of  +7.7% for the cantilevers calibrated using the thermal vibration method and a deviation of  +6.9% for the stiffnesses of the cantilevers calibrated using the improved thermal vibration method.

  1. Quantitative in-situ scanning electron microscope pull-out experiments and molecular dynamics simulations of carbon nanotubes embedded in palladium

    SciTech Connect

    Hartmann, S. Blaudeck, T.; Hermann, S.; Wunderle, B.; Hölck, O.; Schulz, S. E.; Gessner, T.

    2014-04-14

    In this paper, we present our results of experimental and numerical pull-out tests on carbon nanotubes (CNTs) embedded in palladium. We prepared simple specimens by employing standard silicon wafers, physical vapor deposition of palladium and deposition of CNTs with a simple drop coating technique. An AFM cantilever with known stiffness connected to a nanomanipulation system was utilized inside a scanning electron microscope (SEM) as a force sensor to determine forces acting on a CNT during the pull-out process. SEM-images of the cantilever attached to a CNT have been evaluated for subsequent displacement steps with greyscale correlation to determine the cantilever deflection. We compare the experimentally obtained pull-out forces with values of numerical investigations by means of molecular dynamics and give interpretations for deviations according to material impurities or defects and their influence on the pull-out data. We find a very good agreement of force data from simulation and experiment, which is 17 nN and in the range of 10–61 nN, respectively. Our findings contribute to the ongoing research of the mechanical characterization of CNT-metal interfaces. This is of significant interest for the design of future mechanical sensors utilizing the intrinsic piezoresistive effect of CNTs or other future devices incorporating CNT-metal interfaces.

  2. Note: Helical nanobelt force sensors

    NASA Astrophysics Data System (ADS)

    Hwang, G.; Hashimoto, H.

    2012-12-01

    We present the fabrication and characterization of helical nanobelt force sensors. These self-sensing force sensors are based on the giant piezoresistivity of helical nanobelts. The three-dimensional helical nanobelts are self-formed from 27 nm-thick n-type InGaAs/GaAs bilayers using rolled-up techniques, and assembled onto electrodes on a micropipette using nanorobotic manipulations. The helical nanobelt force sensors can be calibrated using a calibrated atomic force microscope cantilever system under scanning electron microscope. Thanks to their giant piezoresistance coefficient (515 × 10-10 Pa-1), low stiffness (0.03125 N/m), large-displacement capability (˜10 μm), and good fatigue resistance, they are well suited to function as stand-alone, compact (˜20 μm without the plug-in support), light (˜5 g including the plug-in support), versatile and large range (˜μN) and high resolution (˜nN) force sensors.

  3. Oscillations of end loaded cantilever beams

    NASA Astrophysics Data System (ADS)

    Macho-Stadler, E.; Elejalde-García, M. J.; Llanos-Vázquez, R.

    2015-09-01

    This article presents several simple experiments based on changing transverse vibration frequencies in a cantilever beam, when acted on by an external attached mass load at the free end. By using a mechanical wave driver, available in introductory undergraduate laboratories, we provide various experimental results for end loaded cantilever beams that fit reasonably well into a linear equation. The behaviour of the cantilever beam’s weak-damping resonance response is studied for the case of metal resonance strips. As the mass load increases, a more pronounced decrease occurs in the fundamental frequency of beam vibration. It is important to note that cantilever construction is often used in architectural design and engineering construction projects but current analysis also predicts the influence of mass load on the sound generated by musical free reeds with boundary conditions similar to a cantilever beam.

  4. High-sensitivity imaging with lateral resonance mode atomic force microscopy.

    PubMed

    Ding, Ren-Feng; Yang, Chih-Wen; Huang, Kuang-Yuh; Hwang, Ing-Shouh

    2016-11-03

    In the operation of a dynamic mode atomic force microscope, a micro-fabricated rectangular cantilever is typically oscillated at or near its mechanical resonance frequency. Lateral bending resonances of cantilevers are rarely used because the resonances are not expected to be detected by the beam-deflection method. In this work, we found that micro-cantilevers with a large tip produced an out-of-plane displacement in lateral resonance (LR), which could be detected with the beam-deflection method. Finite-element analysis indicated that the presence of a large tip is the major source of the out-of-plane coupling for the LR. We also imaged a heterogeneous sample by operating a cantilever in LR, torsional resonance, and tapping modes. LR mode yielded a small deformation and noise level in the height maps as well as a high contrast and small noise level in the phase maps. LR mode also had a resonance frequency that was orders of magnitude higher than that of tapping mode. Operation with LR mode may have the benefits of high-speed scanning, high-sensitivity imaging, and mapping of in-plane mechanical properties of the sample surface. In general, LR mode may become a powerful new atomic force microscopy technique for characterizing sample materials.

  5. A force-level theory of the rheology of entangled rod and chain polymer liquids. I. Tube deformation, microscopic yielding, and the nonlinear elastic limit

    NASA Astrophysics Data System (ADS)

    Schweizer, Kenneth S.; Sussman, Daniel M.

    2016-12-01

    We employ a first-principles-based, force-level approach to construct the anharmonic tube confinement field for entangled fluids of rigid needles, and also for chains described at the primitive-path (PP) level in two limiting situations where chain stretch is assumed to either be completely equilibrated or unrelaxed. The influence of shear and extensional deformation and polymer orientation is determined in a nonlinear elastic limit where dissipative relaxation processes are intentionally neglected. For needles and PP-level chains, a self-consistent analysis of transverse polymer harmonic dynamical fluctuations predicts that deformation-induced orientation leads to tube weakening or widening. In contrast, for deformed polymers in which chain stretch does not relax, we find tube strengthening or compression. For all three systems, a finite maximum transverse entanglement force localizing the polymers in effective tubes is predicted. The conditions when this entanglement force can be overcome by an externally applied force associated with macroscopic deformation can be crisply defined in the nonlinear elastic limit, and the possibility of a "microscopic absolute yielding" event destroying the tube confinement can be analyzed. For needles and contour-relaxed PP chains, this force imbalance occurs at a stress of order the equilibrium shear modulus and a strain of order unity, corresponding to a mechanically fragile entanglement tube field. However, for unrelaxed stretched chains, tube compression stabilizes transverse polymer confinement, and there appears to be no force imbalance. These results collectively suggest that the crossover from elastic to irreversible viscous response requires chain retraction to initiate disentanglement. We qualitatively discuss comparisons with existing phenomenological models for nonlinear startup shear, step strain, and creep rheology experiments.

  6. Visual force sensing with flexible nanowire buckling springs

    NASA Astrophysics Data System (ADS)

    Dobrokhotov, Vladimir V.; Yazdanpanah, Mehdi M.; Pabba, Santosh; Safir, Abdelilah; Cohn, Robert W.

    2008-01-01

    A calibrated method of force sensing is demonstrated in which the buckled shape of a long flexible metallic nanowire, referred to as a 'nanoneedle', is interpreted to determine the applied force. An individual needle of 157 nm diameter by 15.6 µm length is grown on an atomic force microscope (AFM) cantilever with a desired orientation (by the method of Yazdanpanah et al 2005 J. Appl. Phys. 98 073510). Using a nanomanipulator the needle is buckled in the chamber of a scanning electron microscope (SEM) and the buckled shapes are recorded in SEM images. Force is determined as a function of deflection for an assumed elastic modulus by fitting the shapes using the generalized elastica model (De Bona and Zelenika 1997 Proc. Inst. Mech. Eng. C 211 509-17). In this calibration the elastic modulus (68.3 GPa) was determined using an auxiliary AFM measurement, with the needle in the same orientation as in the SEM. Following this calibration the needle was used as a sensor in a different orientation than the AFM coordinates to deflect a suspended PLLA polymer fiber from which the elastic modulus (2.96 GPa) was determined. The practical value of the sensing method does depend on the reliability and ruggedness of the needle. In this study the same needle remained rigidly secured to the AFM cantilever throughout the entire SEM/AFM calibration procedure and the characterization of the nanofiber.

  7. Visual force sensing with flexible nanowire buckling springs.

    PubMed

    Dobrokhotov, Vladimir V; Yazdanpanah, Mehdi M; Pabba, Santosh; Safir, Abdelilah; Cohn, Robert W

    2008-01-23

    A calibrated method of force sensing is demonstrated in which the buckled shape of a long flexible metallic nanowire, referred to as a 'nanoneedle', is interpreted to determine the applied force. An individual needle of 157 nm diameter by 15.6 µm length is grown on an atomic force microscope (AFM) cantilever with a desired orientation (by the method of Yazdanpanah et al 2005 J. Appl. Phys. 98 073510). Using a nanomanipulator the needle is buckled in the chamber of a scanning electron microscope (SEM) and the buckled shapes are recorded in SEM images. Force is determined as a function of deflection for an assumed elastic modulus by fitting the shapes using the generalized elastica model (De Bona and Zelenika 1997 Proc. Inst. Mech. Eng. C 211 509-17). In this calibration the elastic modulus (68.3 GPa) was determined using an auxiliary AFM measurement, with the needle in the same orientation as in the SEM. Following this calibration the needle was used as a sensor in a different orientation than the AFM coordinates to deflect a suspended PLLA polymer fiber from which the elastic modulus (2.96 GPa) was determined. The practical value of the sensing method does depend on the reliability and ruggedness of the needle. In this study the same needle remained rigidly secured to the AFM cantilever throughout the entire SEM/AFM calibration procedure and the characterization of the nanofiber.

  8. Reinterpretation of velocity-dependent atomic friction: influence of the inherent instrumental noise in friction force microscopes.

    PubMed

    Dong, Yalin; Gao, Hongyu; Martini, Ashlie; Egberts, Philip

    2014-07-01

    We have applied both the master equation method and harmonic transition state theory to interpret the velocity-dependent friction behavior observed in atomic friction experiments. To understand the discrepancy between attempt frequencies measured in atomic force microscopy experiments and those estimated by theoretical models, both thermal noise and instrumental noise are introduced into the model. It is found that the experimentally observed low attempt frequency and the transition point at low velocity regimes can be interpreted in terms of the instrumental noise inherent in atomic force microscopy. In contrast to previous models, this model also predicts (1) the existence of a two-slope curve of velocity dependence and (2) the decrease of critical velocity with temperature, which provides clues for further experimental verification of the influence of instrumental noise in friction measurements.

  9. Origin of phase shift in atomic force microscopic investigation of the surface morphology of NR/NBR blend film.

    PubMed

    Thanawan, S; Radabutra, S; Thamasirianunt, P; Amornsakchai, T; Suchiva, K

    2009-01-01

    Atomic force microscopy (AFM) was used to study the morphology and surface properties of NR/NBR blend. Blends at 1/3, 1/1 and 3/1 weight ratios were prepared in benzene and formed film by casting. AFM phase images of these blends in tapping mode displayed islands in the sea morphology or matrix-dispersed structures. For blend 1/3, NR formed dispersed phase while in blends 1/1 and 3/1 phase inversion was observed. NR showed higher phase shift angle in AFM phase imaging for all blends. This circumstance was governed by adhesion energy hysteresis between the device tip and the rubber surface rather than surface stiffness of the materials, as proved by force distance measurements in the AFM contact mode.

  10. Nanoscale adhesion forces between enamel pellicle proteins and hydroxyapatite.

    PubMed

    Vukosavljevic, D; Hutter, J L; Helmerhorst, E J; Xiao, Y; Custodio, W; Zaidan, F C; Oppenheim, F G; Siqueira, W L

    2014-05-01

    The acquired enamel pellicle (AEP) is important for minimizing the abrasion caused by parafunctional conditions as they occur, for instance, during bruxism. It is a remarkable feature of the AEP that a protein/peptide film can provide enough protection in normofunction to prevent teeth from abrasion and wear. Despite its obvious critical role in the protection of tooth surfaces, the essential adhesion features of AEP proteins on the enamel surface are poorly characterized. The objective of this study was to measure the adhesion force between histatin 5, a primary AEP component, and hydroxyapatite (HA) surfaces. Both biotinylated histatin 5 and biotinylated human serum albumin were allowed to adsorb to streptavidin-coated silica microspheres attached to atomic force microscope (AFM) cantilevers. A multimode AFM with a Nanoscope IIIa controller was used to measure the adhesion force between protein-functionalized silica microspheres attached to cantilever tips and the HA surface. The imaging was performed in tapping mode with a Si3N4 AFM cantilever, while the adhesion forces were measured in AFM contact mode. A collection of force-distance curves (~3,000/replicate) was obtained to generate histograms from which the adhesion forces between histatin 5 or albumin and the HA surface were measured. We found that histatin 5 exhibited stronger adhesion forces (90% >1.830 nN) to the HA surface than did albumin (90% > 0.282 nN). This study presents an objective approach to adhesion force measurements between histatin 5 and HA, and provides the experimental basis for measuring the same parameters for other AEP constituents. Such knowledge will help in the design of synthetic proteins and peptides with preventive and therapeutic benefits for tooth enamel.

  11. The Cassie-Wenzel transition of fluids on nanostructured substrates: Macroscopic force balance versus microscopic density-functional theory

    NASA Astrophysics Data System (ADS)

    Tretyakov, Nikita; Papadopoulos, Periklis; Vollmer, Doris; Butt, Hans-Jürgen; Dünweg, Burkhard; Daoulas, Kostas Ch.

    2016-10-01

    Classical density functional theory is applied to investigate the validity of a phenomenological force-balance description of the stability of the Cassie state of liquids on substrates with nanoscale corrugation. A bulk free-energy functional of third order in local density is combined with a square-gradient term, describing the liquid-vapor interface. The bulk free energy is parameterized to reproduce the liquid density and the compressibility of water. The square-gradient term is adjusted to model the width of the water-vapor interface. The substrate is modeled by an external potential, based upon the Lennard-Jones interactions. The three-dimensional calculation focuses on substrates patterned with nanostripes and square-shaped nanopillars. Using both the force-balance relation and density-functional theory, we locate the Cassie-to-Wenzel transition as a function of the corrugation parameters. We demonstrate that the force-balance relation gives a qualitatively reasonable description of the transition even on the nanoscale. The force balance utilizes an effective contact angle between the fluid and the vertical wall of the corrugation to parameterize the impalement pressure. This effective angle is found to have values smaller than the Young contact angle. This observation corresponds to an impalement pressure that is smaller than the value predicted by macroscopic theory. Therefore, this effective angle embodies effects specific to nanoscopically corrugated surfaces, including the finite range of the liquid-solid potential (which has both repulsive and attractive parts), line tension, and the finite interface thickness. Consistently with this picture, both patterns (stripes and pillars) yield the same effective contact angles for large periods of corrugation.

  12. Theory of the laser diode interaction in scanning force microscopy

    SciTech Connect

    Sarid, D.; Iams, D.A.; Ingle, J.T.; Weissenberger, V.

    1989-08-01

    The theory of interaction of a vibrating cantilever and a laser diode used in a scanning force microscope is given in terms of a feedback-dependent parameter C, which determines the gain associated with this interaction. It is shown that both C and the amplitude of vibrations can be determined experimentally from the measurement of the first and second harmonics. Experimental results, which are in good agreement with the theory, yield a value for C which is 0.045. Under these weak feedback conditions, it is found that the interaction can be modeled approximately as a simple homodyne process.

  13. Investigation of the contrast inversion effect on hydrophilic surfaces using Pt/C whisker probes in a scanning force microscope

    NASA Astrophysics Data System (ADS)

    Zhukov, M. V.; Mukhin, I. S.; Levichev, V. V.; Golubok, A. O.

    2015-02-01

    We compare the spatial resolution and image contrast of an erythrocyte surface obtained by means of scanning force microscopy (SFM) with conventional hydrophobic Si probes and probes modified by hydrophilic Pt/C whisker probes. It is shown that probes with Pt/C nanowhiskers provide a higher spatial resolution and contrast when imaging relief on the surface of erythrocytes. The contrast inversion is revealed in some areas of the SFM images when replacing Si probes by probes with Pt/C nanowhiskers. The origin of this inversion in the tapping and contact modes is discussed.

  14. Mechanistic study of dielectric chemical mechanical polishing by spectral and scaling analysis of atomic force microscope images

    SciTech Connect

    Verhoff, M.L.

    1999-12-22

    Thermal oxide and PETEOS oxide surfaces, polished on an IPEC 472 with different combinations of polish pad, slurry, and polishing conditions, were studied with ex situ atomic force microscopy. The post polish surfaces were analyzed qualitatively by visual inspection and quantitatively by spectral and scaling analyses. Spectral and scaling analyses gave consistent interpretations of morphology evolution. Polishing with either a fixed abrasive pad or alumina-based slurry occurred via a mechanism for which asperities are removed and recesses are filled. A sputtering-type mechanism may contribute to material removal when polishing with silica- or ceria-based slurries.

  15. Spatial dependence of polycrystalline FTO’s conductance analyzed by conductive atomic force microscope (C-AFM)

    SciTech Connect

    Peixoto, Alexandre Pessoa; Costa, J. C. da

    2014-05-15

    Fluorine-doped Tin oxide (FTO) is a highly transparent, electrically conductive polycrystalline material frequently used as an electrode in organic solar cells and optical-electronic devices [1–2]. In this work a spatial analysis of the conductive behavior of FTO was carried out by Conductive-mode Atomic Force Microscopy (C-AFM). Rare highly oriented grains sample give us an opportunity to analyze the top portion of polycrystalline FTO and compare with the border one. It is shown that the current flow essentially takes place through the polycrystalline edge at grain boundaries.

  16. Three-dimensional atomic force microscopy: interaction force vector by direct observation of tip trajectory.

    PubMed

    Sigdel, Krishna P; Grayer, Justin S; King, Gavin M

    2013-11-13

    The prospect of a robust three-dimensional atomic force microscope (AFM) holds significant promise in nanoscience. Yet, in conventional AFM, the tip-sample interaction force vector is not directly accessible. We scatter a focused laser directly off an AFM tip apex to rapidly and precisely measure the tapping tip trajectory in three-dimensional space. This data also yields three-dimensional cantilever spring constants, effective masses, and hence, the tip-sample interaction force components via Newton's second law. Significant lateral forces representing 49 and 13% of the normal force (Fz = 152 ± 17 pN) were observed in common tapping mode conditions as a silicon tip intermittently contacted a glass substrate in aqueous solution; as a consequence, the direction of the force vector tilted considerably more than expected. When addressing the surface of a lipid bilayer, the behavior of the force components differed significantly from that observed on glass. This is attributed to the lateral mobility of the lipid membrane coupled with its elastic properties. Direct access to interaction components Fx, Fy, and Fz provides a more complete view of tip dynamics that underlie force microscope operation and can form the foundation of a three-dimensional AFM in a plurality of conditions.

  17. The ReactorAFM: Non-contact atomic force microscope operating under high-pressure and high-temperature catalytic conditions

    SciTech Connect

    Roobol, S. B.; Cañas-Ventura, M. E.; Bergman, M.; Spronsen, M. A. van; Onderwaater, W. G.; Tuijn, P. C. van der; Koehler, R.; Frenken, J. W. M.; Ofitserov, A.; Baarle, G. J. C. van

    2015-03-15

    An Atomic Force Microscope (AFM) has been integrated in a miniature high-pressure flow reactor for in-situ observations of heterogeneous catalytic reactions under conditions similar to those of industrial processes. The AFM can image model catalysts such as those consisting of metal nanoparticles on flat oxide supports in a gas atmosphere up to 6 bar and at a temperature up to 600 K, while the catalytic activity can be measured using mass spectrometry. The high-pressure reactor is placed inside an Ultrahigh Vacuum (UHV) system to supplement it with standard UHV sample preparation and characterization techniques. To demonstrate that this instrument successfully bridges both the pressure gap and the materials gap, images have been recorded of supported palladium nanoparticles catalyzing the oxidation of carbon monoxide under high-pressure, high-temperature conditions.

  18. Directly probing rapid membrane protein dynamics with an atomic force microscope: a study of light-induced conformational alterations in bacteriorhodopsin.

    PubMed

    Lewis, A; Rousso, I; Khachatryan, E; Brodsky, I; Lieberman, K; Sheves, M

    1996-05-01

    This paper demonstrates that an atomic force microscope can be used to directly monitor rapid membrane protein dynamics. For this demonstration the membrane-bound proton pump, bacteriorhodopsin, has been investigated. It has been unequivocally shown that the light-induced dynamic alterations that have been observed do not arise from external artifacts such as heating of the sample by the incident light, but that these changes can be directly linked to the light-induced protein conformational alterations in this membrane. In essence, it has been shown that the light energy absorbed by bacteriorhodopsin is converted not only to chemical energy but also to mechanical energy. In summary a new ultrasensitive tool is described for monitoring the molecular dynamics of materials with wide applicability to fundamental and applied science.

  19. Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy.

    PubMed

    Chung, Koo-Hyun; Shaw, Gordon A; Pratt, Jon R

    2009-06-01

    The absolute force sensitivities of colloidal probes comprised of atomic force microscope, or AFM, cantilevers with microspheres attached to their distal ends are measured. The force sensitivities are calibrated through reference to accurate electrostatic forces, the realizations of which are described in detail. Furthermore, the absolute accuracy of a common AFM force calibration scheme, known as the thermal noise method, is evaluated. It is demonstrated that the thermal noise method can be applied with great success to colloidal probe calibration in air and in liquid to yield force measurements with relative standard uncertainties below 5%. Techniques to combine the electrostatics-based determination of the AFM force sensitivity with measurements of the colloidal probe's thermal noise spectrum to compute noncontact estimates of the displacement sensitivity and spring constant are also developed.

  20. Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy

    SciTech Connect

    Chung, Koo-Hyun; Shaw, Gordon A.; Pratt, Jon R.

    2009-06-15

    The absolute force sensitivities of colloidal probes comprised of atomic force microscope, or AFM, cantilevers with microspheres attached to their distal ends are measured. The force sensitivities are calibrated through reference to accurate electrostatic forces, the realizations of which are described in detail. Furthermore, the absolute accuracy of a common AFM force calibration scheme, known as the thermal noise method, is evaluated. It is demonstrated that the thermal noise method can be applied with great success to colloidal probe calibration in air and in liquid to yield force measurements with relative standard uncertainties below 5%. Techniques to combine the electrostatics-based determination of the AFM force sensitivity with measurements of the colloidal probe's thermal noise spectrum to compute noncontact estimates of the displacement sensitivity and spring constant are also developed.