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Sample records for kev ion beam

  1. Neutral beam injector for 475 keV MARS sloshing ions

    SciTech Connect

    Goebel, D.M.; Hamilton, G.W.

    1983-12-13

    A neutral beam injector system which produces 5 MW of 475 keV D/sup 0/ neutrals continuously on target has been designed. The beamline is intended to produce the sloshing ion distribution required in the end plug region of the conceptual MARS tandem mirror commercial reactor. The injector design utilizes the LBL self-extraction negative ion source and Transverse Field Focusing (TFF) accelerator to generate a long, ribbon ion beam. A laser photodetachment neutralizer strips over 90% of the negative ions. Magnetic and neutron shield designs are included to exclude the fringe fields of the end plug and provide low activation by the neutron flux from the target plasma. The use of a TFF accelerator and photodetachment neutralizer produces a total system electrical efficiency of about 63% for this design.

  2. Electron collisional detachment processes for a 250 keV D- ion beam in a partially ionized hydrogen target

    NASA Astrophysics Data System (ADS)

    Savas, S. E.

    1981-08-01

    Neutral atom beams with energies above 200 keV are required for various purposes in magnetic fusion devices following TFTR, JET and MFTF-B. These beams are produced much more efficiently by electron detachment from negative ion beams than by electron capture by positive ions. The efficiency with which such neutral atoms can be produced by electron detachment in partially ionized hydrogen plasma neutralizers is investigated. Neutralization efficiencies for partially ionized hydrogen targets are calculated making use of cross sections. Previously calculated only for a pure electron gas neutralizer, this result was extended to conditions of arbitrary mixture of hydrogen gas and plasma using an averaging technique on the cross sections for the different target species. The effect of mixtures with contaminating gases and O2 and N2 on the neutralizer efficiency are also studied.

  3. Surface modifications of hydrogen storage alloy by heavy ion beams with keV to MeV irradiation energies

    NASA Astrophysics Data System (ADS)

    Abe, Hiroshi; Tokuhira, Shinnosuke; Uchida, Hirohisa; Ohshima, Takeshi

    2015-12-01

    This study deals with the effect of surface modifications induced from keV to MeV heavy ion beams on the initial reaction rate of a hydrogen storage alloy (AB5) in electrochemical process. The rare earth based alloys like this sample alloy are widely used as a negative electrode of Ni-MH (Nickel-Metal Hydride) battery. We aimed to improve the initial reaction rate of hydrogen absorption by effective induction of defects such as vacancies, dislocations, micro-cracks or by addition of atoms into the surface region of the metal alloys. Since defective layer near the surface can easily be oxidized, the conductive oxide layer is formed on the sample surface by O+ beams irradiation, and the conductive oxide layer might cause the improvement of initial reaction rate of hydriding. This paper demonstrates an effective surface treatment of heavy ion irradiation, which induces catalytic activities of rare earth oxides in the alloy surface.

  4. Electron collisional detachment processes for a 250 keV D/sup -/ ion beam in a partially ionized hydrogen target

    SciTech Connect

    Savas, S.E.

    1980-09-01

    Neutral atom beams with energies above 200 keV may be required for various purposes in magnetic fusion devices following TFTR, JET and MFTF-B. These beams can be produced much more efficiently by electron detachment from negative ion beams than by electron capture by positive ions. We have investigated the efficiency with which such neutral atoms can be produced by electron detachment in partially ionized hydrogen plasma neutralizers.

  5. FABRICATION AND REPAIR OF ION SOURCE COMPONENTS IN THE 80 keV NEUTRAL BEAM LINES FOR DIII-D

    SciTech Connect

    GRUNLOH,H.J; BUSATH,J.L; CALLIS,R.W; CHIU,H.K; DiMARTINO,M; HONG,R; KLASEN,R; MOELLER,C.P; ROBINSON,J.I; STRECKERT,H.H; TAO,R; TRESTER,P.W

    2003-10-01

    OAK-B135 After 8 years of operation, leaks began to develop in critical components of the ion sources of the 80 keV neutral beam lines in DIII-D. Operational adjustments were made that seemed to remedy the problems, but five years later leaks began occurring again, this time with greater frequency. Failures occurred in the stainless steel bellows and molybdenum rails of the grid rail modules as well as in the Langmuir probes. Failure analyses identified several root causes of the leaks and operational adjustments were again made to mitigate the problems, but the rash of failures depleted the program's supply of spare grid rail modules and probes and removed one of the ion sources from regular operation. Fifteen years after their original fabrication, the ion source components were no longer commercially available. In 2001, a program was initiated to fabricate new grid rail modules, including new molybdenum grid rails, bellows, and stainless steel grid rail holders, as well as new Langmuir probes. In parallel, components removed from service due to leaks were to be repaired with new rails and bellows and returned to service. An overview of the root causes of the service failures is offered, details of the repair processes are described, and a summary and evaluation of the fabrication procedures for the new molybdenum rails, grid modules, and Langmuir probes are given.

  6. Development of a long-pulse (30-s), high-energy (120-keV) ion source for neutral-beam applications

    SciTech Connect

    Tsai, C.C.; Barber, G.C.; Blue, C.W.

    1983-01-01

    Multimegawatt neutral beams of hydrogen or deuterium atoms are needed for fusion machine applications such as MFTB-B, TFTR-U, DIII-U, and FED (INTOR or ETR). For these applications, a duoPIGatron ion source is being developed to produce high-brightness deuterium beams at a beam energy of approx. 120 keV for pulse lengths up to 30 s. A long-pulse plasma generator with active water cooling has been operated at an arc level of 1200 A with 30-s pulse durations. The plasma density and uniformity are sufficient for supplying a 60-A beam of hydrogen ions to a 13- by 43-cm accelerator. A 10- by 25-cm tetrode accelerator has been operated to form 120-keV hydrogen ion beams. Using the two-dimensional (2-D) ion extraction code developed at Oak Ridge National Laboratory (ORNL), a 13- by 43-cm tetrode accelerator has been designed and is being fabricated. The aperture shapes of accelerator grids are optimized for 120-keV beam energy.

  7. Structural and optical properties of 70-keV carbon ion beam synthesized carbon nanoclusters in thermally grown silicon dioxide

    NASA Astrophysics Data System (ADS)

    Poudel, P. R.; Poudel, P. P.; Paramo, J. A.; Strzhemechny, Y. M.; Rout, B.; McDaniel, F. D.

    2014-09-01

    The structural and optical properties of carbon nanoclusters formed in thermally grown silicon dioxide film via the ion beam synthesis process have been investigated. A low-energy (70 keV) carbon ion beam (C-) at a fluence of 3 × 1017 atoms/cm2 was used for implantation into a thermally grown silicon dioxide layer (500 nm thick) on a Si (100) wafer. Several parts of the implanted samples were subsequently annealed in a gas mixture (4 % H2 + 96 % Ar) at 900 °C for different time periods. The as-implanted and annealed samples were characterized by X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy, Raman spectroscopy, transmission electron microscopy (TEM), and photoluminescence spectroscopy (PL). The carbon ion implantation depth profile was simulated using a widely used Monte Carlo-based simulation code SRIM-2012. Additionally, the elemental depth profile of the implanted carbon along with host elements of silicon and oxygen were simulated using a dynamic ion-solid interaction code T-DYN, which incorporates the effects of the surface sputtering and gradual change in the elemental composition in the implanted layers due to high-fluence ion implantation. The elemental depth profile obtained from the XPS measurements matches closely to the T-DYN predictions. Raman measurements indicate the formation of graphitic phases in the annealed samples. The graphitic peak (G-peak) was found to be increased with the annealing time duration. In the sample annealed for 10 min, the sizes of the carbon nanoclusters were found to be 1-4 nm in diameter using TEM. The PL measurements at room temperature using a 325-nm laser show broad-band emissions in the ultraviolet to visible range in the as-implanted sample. Intense narrow bands along with the broad bands were observed in the annealed samples. The defects present in the as-grown samples along with carbon ion-induced defect centers in the as-implanted samples are the main contributors to the observed

  8. Structural and optical properties of 70-keV carbon ion beam synthesized carbon nanoclusters in thermally grown silicon dioxide

    NASA Astrophysics Data System (ADS)

    Poudel, P. R.; Poudel, P. P.; Paramo, J. A.; Strzhemechny, Y. M.; Rout, B.; McDaniel, F. D.

    2015-02-01

    The structural and optical properties of carbon nanoclusters formed in thermally grown silicon dioxide film via the ion beam synthesis process have been investigated. A low-energy (70 keV) carbon ion beam (C-) at a fluence of 3 × 1017 atoms/cm2 was used for implantation into a thermally grown silicon dioxide layer (500 nm thick) on a Si (100) wafer. Several parts of the implanted samples were subsequently annealed in a gas mixture (4 % H2 + 96 % Ar) at 900 °C for different time periods. The as-implanted and annealed samples were characterized by X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy, Raman spectroscopy, transmission electron microscopy (TEM), and photoluminescence spectroscopy (PL). The carbon ion implantation depth profile was simulated using a widely used Monte Carlo-based simulation code SRIM-2012. Additionally, the elemental depth profile of the implanted carbon along with host elements of silicon and oxygen were simulated using a dynamic ion-solid interaction code T-DYN, which incorporates the effects of the surface sputtering and gradual change in the elemental composition in the implanted layers due to high-fluence ion implantation. The elemental depth profile obtained from the XPS measurements matches closely to the T-DYN predictions. Raman measurements indicate the formation of graphitic phases in the annealed samples. The graphitic peak (G-peak) was found to be increased with the annealing time duration. In the sample annealed for 10 min, the sizes of the carbon nanoclusters were found to be 1-4 nm in diameter using TEM. The PL measurements at room temperature using a 325-nm laser show broad-band emissions in the ultraviolet to visible range in the as-implanted sample. Intense narrow bands along with the broad bands were observed in the annealed samples. The defects present in the as-grown samples along with carbon ion-induced defect centers in the as-implanted samples are the main contributors to the observed

  9. Ion Beam Materials Analysis and Modifications at keV to MeV Energies at the University of North Texas

    NASA Astrophysics Data System (ADS)

    Rout, Bibhudutta; Dhoubhadel, Mangal S.; Poudel, Prakash R.; Kummari, Venkata C.; Lakshantha, Wickramaarachchige J.; Manuel, Jack E.; Bohara, Gyanendra; Szilasi, Szabolcs Z.; Glass, Gary A.; McDaniel, Floyd D.

    2014-02-01

    The University of North Texas (UNT) Ion Beam Modification and Analysis Laboratory (IBMAL) has four particle accelerators including a National Electrostatics Corporation (NEC) 9SDH-2 3 MV tandem Pelletron, a NEC 9SH 3 MV single-ended Pelletron, and a 200 kV Cockcroft-Walton. A fourth HVEC AK 2.5 MV Van de Graaff accelerator is presently being refurbished as an educational training facility. These accelerators can produce and accelerate almost any ion in the periodic table at energies from a few keV to tens of MeV. They are used to modify materials by ion implantation and to analyze materials by numerous atomic and nuclear physics techniques. The NEC 9SH accelerator was recently installed in the IBMAL and subsequently upgraded with the addition of a capacitive-liner and terminal potential stabilization system to reduce ion energy spread and therefore improve spatial resolution of the probing ion beam to hundreds of nanometers. Research involves materials modification and synthesis by ion implantation for photonic, electronic, and magnetic applications, micro-fabrication by high energy (MeV) ion beam lithography, microanalysis of biomedical and semiconductor materials, development of highenergy ion nanoprobe focusing systems, and educational and outreach activities. An overview of the IBMAL facilities and some of the current research projects are discussed.

  10. Improvement of a 500 keV heavy-ion-beam probe for JIPP T-IIU tokamak

    NASA Astrophysics Data System (ADS)

    Hamada, Y.; Kawasumi, Y.; Nishizawa, A.; Narihara, K.; Sato, K.; Seki, T.; Toi, K.; Iguchi, H.; Fujisawa, A.; Adachi, K.; Ejiri, A.; Hidekuma, S.; Hirokura, S.; Ida, K.; Kawahata, K.; Kojima, M.; Joong, K.; Kumazawa, R.; Kuramoto, H.; Liang, R.; Minami, T.; Sakakita, H.; Sasao, M.; Sato, K. N.; Tsuzuki, T.; Xu, J.; Yamada, I.; Watari, T.

    1995-01-01

    Several improvements in the high-voltage heavy-ion-beam probe (HIBP) are discussed. (1) It is clearly found that the precision slide mount of the detector plates 30° parallel to the base electrode is very effective for the determination of the in-plane entrance angle of the beam in the analyzer to estimate the error in the potential measurement. (2) A two-staged optical trap in the HIBP greatly reduced the effect of the UV radiation in the analyzer. (3) A multiple-plate detector up to 13 measurement points clearly showed the direction of the propagation of the turbulence and path-integral effects.

  11. Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling.

    PubMed

    Mayer, Marcel; Keskinbora, Kahraman; Grévent, Corinne; Szeghalmi, Adriana; Knez, Mato; Weigand, Markus; Snigirev, Anatoly; Snigireva, Irina; Schütz, Gisela

    2013-05-01

    Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ~10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficulties of manufacturing high-aspect-ratio zone plates using conventional techniques. Here, employing a method of fabrication based on atomic layer deposition (ALD) and focused ion beam (FIB) milling, FZPs with very high aspect ratios were prepared. Such multilayer FZPs with outermost zone widths of 10 and 35 nm and aspect ratios of up to 243 were tested for their focusing properties at 8 keV and shown to focus hard X-rays efficiently. This success was enabled by the outstanding layer quality thanks to ALD. Via the use of FIB for slicing the multilayer structures, desired aspect ratios could be obtained by precisely controlling the thickness. Experimental diffraction efficiencies of multilayer FZPs fabricated via this combination reached up to 15.58% at 8 keV. In addition, scanning transmission X-ray microscopy experiments at 1.5 keV were carried out using one of the multilayer FZPs and resolved a 60 nm feature size. Finally, the prospective of different material combinations with various outermost zone widths at 8 and 17 keV is discussed in the light of the coupled wave theory and the thin-grating approximation. Al2O3/Ir is outlined as a promising future material candidate for extremely high resolution with a theoretical efficiency of more than 20% for as small an outermost zone width as 10 nm at 17 keV.

  12. Compact, maintainable 80-KeV neutral beam module

    DOEpatents

    Fink, Joel H.; Molvik, Arthur W.

    1980-01-01

    A compact, maintainable 80-keV arc chamber, extractor module for a neutral beam system immersed in a vacuum of <10.sup.-2 Torr, incorporating a nested 60-keV gradient shield located midway between the high voltage ion source and surrounding grounded frame. The shield reduces breakdown or arcing path length without increasing the voltage gradient, tends to keep electric fields normal to conducting surfaces rather than skewed and reduces the peak electric field around irregularities on the 80-keV electrodes. The arc chamber or ion source is mounted separately from the extractor or ion accelerator to reduce misalignment of the accelerator and to permit separate maintenance to be performed on these systems. The separate mounting of the ion source provides for maintaining same without removing the ion accelerator.

  13. Atom penetration from a thin film into the substrate during sputtering by polyenergetic Ar{sup +} ion beam with mean energy of 9.4 keV

    SciTech Connect

    Kalin, B.A.; Gladkov, V.P.; Volkov, N.V.; Sabo, S.E.

    1995-12-31

    Penetration of alien atoms (Be, Ni) into Be, Al, Zr, Si and diamond was investigated under Ar{sup +} ion bombardment of samples having thermally evaporated films of 30--50 nm. Sputtering was carried out using a wide energy spectrum beam of Ar{sup +} ions of 9.4 keV to dose D = 1 {times} 10{sup 16}--10{sup 19} ion/cm{sup 2}. Implanted atom distribution in the targets was measured by Rutherford backscattering spectrometry (RBS) of H{sup +} and He{sup +} ions with energy of 1.6 MeV as well as secondary ion mass-spectrometry (SIMS). During the bombardment, the penetration depth of Ar atoms increases with dose linearly. This depth is more than 3--20 times deeper than the projected range of bombarding ions and recoil atoms. This is a deep action effect. The analysis shows that the experimental data for foreign atoms penetration depth are similar to the data calculated for atom migration through the interstitial site in a field of internal (lateral) compressive stresses created in the near-surface layer of the substrate as a result of implantation. Under these experimental conditions atom ratio r{sub i}/r{sub m} (r{sub i} -- radius of dopant, r{sub m} -- radius target of substrate) can play a principal determining role.

  14. A DLTS and RBS analysis of the angular dependence of defects introduced in Si during ion beam channelling using 435keV alpha-particles

    NASA Astrophysics Data System (ADS)

    Deenapanray, P. N. K.; Ridgway, M. C.; Auret, F. D.; Friedland, E.

    1998-03-01

    It is generally assumed that ion beams (IBs) used during channelling experiments create little damage when incident along a direction of low crystallographic index of a crystal lattice. We have employed deep level transient spectroscopy (DLTS) to characterise the defects produced by 435 keV alpha-particles in a Si lattice incident along the <1 0 0> axis ( α = 0°) as well as at small angles ( α ≤ 7°) with respect to this direction. The commonly observed high energy (MeV) alpha-particle-induced point defects (VO and VSb pairs and the two charge states of the divacancy, V 2) could be observed for angles of incidence as small as 0.35°. The concentration of the primary defects was observed to decrease for α ≥ 2.45°. Furthermore, isochronal annealing experiments showed that a DLTS defect peak which is superimposed on the V2{=}/{-}, and observed predominantly for α ≥ 2.45°, could be a V-related defect. Current-voltage ( I- V) and capacitance-voltage ( C- V) measurements also showed that Schottky barrier diodes (SBDs) fabricated on the exposed samples became less rectifying with increasing angle of incidence.

  15. Absolute Measurements of keV Electron Beams

    NASA Astrophysics Data System (ADS)

    Zink, J. L.; Allegrini, F.; Ogasawara, K.

    2016-12-01

    Space plasma instruments are tested and calibrated before they are flown in space. The calibration tests include measuring the response of the instruments and their detectors to ion, electron, or neutral atom beams of known intensity. In addition to the relative responses of the devices, it is important to understand the absolute measurements and detection efficiencies of the detectors, which are more challenging. With an ion beam, the absolute beam intensity can be obtained using coincidence measurements. From Funsten et al., 2005, the coincidences originate from forward and backward electrons that are emitted from a carbon foil when an ion passes through. This coincidence method may also be applied for an electron beam, but the chance of large uncertainties and offsets increases since there are significantly lower electron emissions from electrons themselves. In this paper, we compare measurements from an absolute beam monitor with the coincidence method and an avalanche photodiode that are subject to 3 to 30 keV electron beams. Unlike other detection methods, such as Faraday cups, both methods presented allow counting the individual detected electrons.

  16. Design and fabrication of a Transverse Field Focussing (TFF) 180 keV negative ion accelerator

    SciTech Connect

    Matuk, C.A.; Anderson, O.A.; Owren, H.M.; Paterson, J.A.; Purgalis, P.

    1985-11-01

    The 180 keV Transverse Field Focussing (TFF) negative ion accelerator described is the final component of a negative ion based neutral beam acceleration system which is being developed as proof-of-principle demonstration of a radiation hardened neutral beamline. The 180 keV beamline consists of: a surface conversion negative ion source, a 80 keV pre-accelerator, a TFF pumping, matching, and transport section, and the 180 keV TFF accelerator presented. This beamline is expected to provide 1 A of H/sup -/ at 180 keV. In the design of the accelerator, particular importance was given to the rigidity of the accelerator electrode mounting structures and to the electrical isolation of the electrodes along with their related cooling lines. An optical alignment scheme was developed to assemble and to insure precision alignment of the electrodes. (LEW)

  17. Ion beam mixing by focused ion beam

    NASA Astrophysics Data System (ADS)

    Barna, Árpád; Kotis, László; Lábár, János L.; Osváth, Zoltán; Tóth, Attila L.; Menyhárd, Miklós; Zalar, Anton; Panjan, Peter

    2007-09-01

    Si amorphous (41 nm)/Cr polycrystalline (46 nm) multilayer structure was irradiated by 30 keV Ga+ ions with fluences in the range of 25-820 ions/nm2 using a focused ion beam. The effect of irradiation on the concentration distribution was studied by Auger electron spectroscopy depth profiling, cross-sectional transmission electron microscopy, and atomic force microscopy. The ion irradiation did not result in roughening on the free surface. On the other hand, the Ga+ irradiation produced a strongly mixed region around the first Si/Cr interface. The thickness of mixed region depends on the Ga+ fluence and it is joined to the pure Cr matrix with an unusual sharp interface. With increasing fluence the width of the mixed region increases but the interface between the mixed layer and pure Cr remains sharp. TRIDYN simulation failed to reproduce this behavior. Assuming that the Ga+ irradiation induces asymmetric mixing, that is during the mixing process the Cr can enter the Si layer, but the Si cannot enter the Cr layer, the experimental findings can qualitatively be explained.

  18. Topography evolution of 500 keV Ar(4+) ion beam irradiated InP(100) surfaces - formation of self-organized In-rich nano-dots and scaling laws.

    PubMed

    Sulania, Indra; Agarwal, Dinesh C; Kumar, Manish; Kumar, Sunil; Kumar, Pravin

    2016-07-27

    We report the formation of self-organized nano-dots on the surface of InP(100) upon irradiating it with a 500 keV Ar(4+) ion beam. The irradiation was carried out at an angle of 25° with respect to the normal at the surface with 5 different fluences ranging from 1.0 × 10(15) to 1.0 × 10(17) ions per cm(2). The morphology of the ion-irradiated surfaces was examined by atomic force microscopy (AFM) and the formation of the nano-dots on the irradiated surfaces was confirmed. The average size of the nano-dots varied from 44 ± 14 nm to 94 ± 26 nm with increasing ion fluence. As a function of the ion fluence, the variation in the average size of the nano-dots has a great correlation with the surface roughness, which changes drastically up to the ion fluence of 1.0 × 10(16) ions per cm(2) and attains almost a saturation level for further irradiation. The roughness and the growth exponent values deduced from the scaling laws suggest that the kinetic sputtering and the large surface diffusion steps of the atoms are the primary reasons for the formation of the self-organized nanodots on the surface. X-ray photo-electron spectroscopy (XPS) studies show that the surface stoichiometry changes with the ion fluence. With irradiation, the surface becomes more indium (In)-rich owing to the preferential sputtering of the phosphorus atoms (P) and the pure metallic In nano-dots evolve at the highest ion fluence. The cross-sectional scanning electron microscopy (SEM) analysis of the sample irradiated with the highest fluence showed the absence of the nanostructuring beneath the surface. The surface morphological changes at this medium energy ion irradiation are discussed in correlation with the low and high energy experiments to shed more light on the mechanism of the well separated nano-dot formation.

  19. Modified betatron for ion beam fusion

    SciTech Connect

    Rostoker, N.; Fisher, A.

    1986-01-01

    An intense neutralized ion beam can be injected and trapped in magnetic mirror or tokamak geometry. The details of the process involve beam polarization so that the beam crosses the fringing fields without deflection and draining the polarization when the beam reaches the plasma. Equilibrium requires that a large betatron field be added in tokamak geometry. In mirror geometry a toroidal field must be added by means of a current along the mirror axis. In either case, the geometry becomes that of the modified betatron which has been studied experimentally and theoretically in recent years. We consider beams of d and t ions with a mean energy of 500 kev and a temperature of about 50 kev. The plasma may be a proton plasma with cold ions. It is only necessary for beam trapping or to carry currents. The ion energy for slowing down is initially 500 kev and thermonuclear reactions depend only on the beam temperature of 50 kev which changes very slowly. This new configuration for magnetic confinement fusion leads to an energy gain of 10--20 for d-t reactions whereas previous studies of beam target interaction predicted a maximum energy gain of 3--4. The high beam energy available with pulsed ion diode technology is also essential for advanced fuels. 16 refs., 3 figs.

  20. Is keV ion-induced pattern formation on Si(001) caused by metal impurities?

    PubMed

    Macko, Sven; Frost, Frank; Ziberi, Bashkim; Förster, Daniel F; Michely, Thomas

    2010-02-26

    We present ion beam erosion experiments performed in ultrahigh vacuum using a differentially pumped ion source and taking care that the ion beam hits the Si(001) sample only. Under these conditions no ion beam patterns form on Si for angles theta < or = 45 degrees with respect to the global surface normal using 2 keV Kr+ and fluences of approximately 2 x 10(22) ions m(-2). In fact, the ion beam induces a smoothening of preformed patterns. Simultaneous sputter deposition of stainless steel in this angular range creates a variety of patterns, similar to those previously ascribed to clean ion-beam-induced destabilization of the surface profile. Only for grazing incidence with 60 degrees < or = theta < or = 83 degrees do pronounced ion beam patterns form. It appears that the angular-dependent stability of Si(001) against pattern formation under clean ion beam erosion conditions is related to the angular dependence of the sputtering yield, and not primarily to a curvature-dependent yield as invoked frequently in continuum theory models.

  1. Mutagenic effect of a keV range N + beam on mammalian cells

    NASA Astrophysics Data System (ADS)

    Feng, Huiyun; Wu, Lijun; Yu, Lixiang; Han, Wei; Liu, Xuelan; Yu, Zengliang

    2005-07-01

    The radiobiological effects of a keV (5-20 keV) range nitrogen ion (N +) beam on mammalian cells were studied, particularly with regard to the induction of mutation in the cell genome. The experiment demonstrated that the 20 keV N + beam, which resulted in cell death to a certain extent, induced a 2-3 fold increase in the mutation rates at the CD59 gene locus of the mammalian A L cells as compared to the control. Within certain fluence ranges (0-6 × 10 14 N +/cm 2), the cell survival displayed a down-up-down pattern which is similar to the phenomenon known as 'hyper-radiosensitivity' manifested under low-dose irradiation; the CD59 mutation rate firstly showed a gradual rise up to a 3-fold increment above the background level as the ion fluence went up to 4 × 10 14 N +/cm 2, after this peak point however, a downtrend appeared though the ion fluence increased further. It was also observed that the fraction of CD59 mutation bears no proportional relation to ion energy in further experiments of mutation induction by N + beams with the incident energies of 5, 10, 15 and 20 keV at the same fluence of 3 × 10 14 N +/cm 2. Analyses of the deletion patterns of chromosome 11 in CD59- mutants induced by 5-20 keV N + beams showed that these ions did not result in large-size chromosome deletions in this mammalian cell system. A preliminary discussion, suggesting that the mutagenic effect of such low-energy ion influx on mammalian cells could result from multiple processes involving direct collision of particles with cellular DNA, and cascade atomic and molecular reactions due to plentiful primary and secondary particles, was also presented. The study provided the first glimpse into the roles low-energy ions may play in inducing mutagenesis in mammalian cells, and results will be of much value in helping people to understand the contribution of low-energy ions to radiological effects of various ionising radiations.

  2. A very sensitive nonintercepting beam average velocity monitoring system for the TRIUMF 300-keV injection line

    SciTech Connect

    Yin, Y.; Laxdal, R.E.; Zelenski, A.; Ostroumov, P.

    1997-01-01

    A nonintercepting beam velocity monitoring system has been installed in the 300-keV injection line of the TRIUMF cyclotron to reproduce the injection energy for beam from different ion sources and to monitor any beam energy fluctuations. By using a programmable beam signal leveling method the system can work with a beam current dynamic range of 50 dB. Using synchronous detection, the system can detect 0.5 eV peak-to-peak energy modulation of the beam, sensitivity is 1.7{times}10{sup {minus}6}. The paper will describe the principle and beam measurement results. {copyright} {ital 1997 American Institute of Physics.}

  3. ALLIGATOR - An apparatus for ion beam assisted deposition with a broad-beam ion source

    NASA Astrophysics Data System (ADS)

    Wituschek, H.; Barth, M.; Ensinger, W.; Frech, G.; Rück, D. M.; Leible, K. D.; Wolf, G. K.

    1992-04-01

    Ion beam assisted deposition is a versatile technique for preparing thin films and coatings for various applications. Up to now a prototype setup for research purposes has been used in our laboratory. Processing of industrial standard workpieces requires a high current ion source with broad beam and high uniformity for homogeneous bombardment. In this contribution a new apparatus for large area samples will be described. It is named ALLIGATOR (German acronym of facility for ion assisted evaporation on transverse movable or rotary targets). In order to have a wide energy range available two ion sources are used. One delivers a beam energy up to 1.3 keV. The other is suitable for energies from 5 keV up to 40 keV. The ``high-energy'' ion source is a multicusp multiaperture source with 180-mA total current and a beam diameter of 280 mm at the target position.

  4. Broad beam ion implanter

    DOEpatents

    Leung, K.N.

    1996-10-08

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes. 6 figs.

  5. Broad beam ion implanter

    DOEpatents

    Leung, Ka-Ngo

    1996-01-01

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes.

  6. Ion Beam Propulsion Study

    NASA Technical Reports Server (NTRS)

    2008-01-01

    The Ion Beam Propulsion Study was a joint high-level study between the Applied Physics Laboratory operated by NASA and ASRC Aerospace at Kennedy Space Center, Florida, and Berkeley Scientific, Berkeley, California. The results were promising and suggested that work should continue if future funding becomes available. The application of ion thrusters for spacecraft propulsion is limited to quite modest ion sources with similarly modest ion beam parameters because of the mass penalty associated with the ion source and its power supply system. Also, the ion source technology has not been able to provide very high-power ion beams. Small ion beam propulsion systems were used with considerable success. Ion propulsion systems brought into practice use an onboard ion source to form an energetic ion beam, typically Xe+ ions, as the propellant. Such systems were used for steering and correction of telecommunication satellites and as the main thruster for the Deep Space 1 demonstration mission. In recent years, "giant" ion sources were developed for the controlled-fusion research effort worldwide, with beam parameters many orders of magnitude greater than the tiny ones of conventional space thruster application. The advent of such huge ion beam sources and the need for advanced propulsion systems for exploration of the solar system suggest a fresh look at ion beam propulsion, now with the giant fusion sources in mind.

  7. Funnel cone for focusing intense ion beams on a target

    SciTech Connect

    Bieniosek, F.M.; Henestroza, E.; Ni, P.

    2009-10-05

    We describe a funnel cone for concentrating an ion beam on a target. The cone utilizes the reflection characteristic of ion beams on solid walls to focus the incident beam andincrease beam intensity on target. The cone has been modeled with the TRIM code. A prototype has been tested and installed for use in the 350-keV K+ NDCX target chamber.

  8. Maskless, resistless ion beam lithography

    SciTech Connect

    Ji, Qing

    2003-01-01

    As the dimensions of semiconductor devices are scaled down, in order to achieve higher levels of integration, optical lithography will no longer be sufficient for the needs of the semiconductor industry. Alternative next-generation lithography (NGL) approaches, such as extreme ultra-violet (EUV), X-ray, electron-beam, and ion projection lithography face some challenging issues with complicated mask technology and low throughput. Among the four major alternative NGL approaches, ion beam lithography is the only one that can provide both maskless and resistless patterning. As such, it can potentially make nano-fabrication much simpler. This thesis investigates a focused ion beam system for maskless, resistless patterning that can be made practical for high-volume production. In order to achieve maskless, resistless patterning, the ion source must be able to produce a variety of ion species. The compact FIB system being developed uses a multicusp plasma ion source, which can generate ion beams of various elements, such as O2+, BF2+, P+ etc., for surface modification and doping applications. With optimized source condition, around 85% of BF2+, over 90% of O2+ and P+ have been achieved. The brightness of the multicusp-plasma ion source is a key issue for its application to maskless ion beam lithography. It can be substantially improved by optimizing the source configuration and extractor geometry. Measured brightness of 2 keV He+ beam is as high as 440 A/cm2 • Sr, which represents a 30x improvement over prior work. Direct patterning of Si thin film using a focused O2+ ion beam has been investigated. A thin surface oxide film can be selectively formed using 3 keV O2+ ions with the dose of 1015 cm-2. The oxide can then serve as a hard mask for patterning of the Si film. The

  9. The System of Nanosecond 280-KeV He+ Pulsed Beam

    SciTech Connect

    Junphong, P.; Ano, V.; Lekprasert, B.; Suwannakachorn, D.; Thongnopparat, N.; Vilaithong, T.; Wiedemann, H.; /SLAC /SLAC, SSRL

    2006-05-01

    At Fast Neutron Research Facility, the 150 kV-pulses neutron generator is being upgraded to a 280-kV-pulsed-He beam for time-of-flight Rutherford backscattering spectrometry. It involves replacing the existing beam line elements by a multicusp ion source, a 400-kV accelerating tube, 45{sup o}-double focusing dipole magnet and quadrupole lens. The multicusp ion source is a compact filament-driven of 2.6 cm in diameter and 8 cm in length. The current extracted is 20.4 {micro}A with 13 kV of extraction voltage and 8.8 kV of Einzel lens voltage. The beam emittance has found to vary between 6-12 mm mrad. The beam transport system has to be redesigned based on the new elements. The important part of a good pulsed beam depends on the pulsing system. The two main parts are the chopper and buncher. An optimized geometry for the 280 keV pulsed helium ion beam will be presented and discussed. The PARMELA code has been used to optimize the space charge effect, resulting in pulse width of less than 2 ns at a target. The calculated distance from a buncher to the target is 4.6 m. Effects of energy spread and phase angle between chopper and buncher have been included in the optimization of the bunch length.

  10. Application of keV and MeV ion microbeams through tapered glass capillaries

    NASA Astrophysics Data System (ADS)

    Ikeda, T.; Kojima, T. M.; Kobayashi, T.; Meissl, W.; Mäckel, V.; Kanai, Y.; Yamazaki, Y.

    2012-11-01

    We have developed a method to produce micrometer-sized beams of keV energy highly charged ions (HCIs) and MeV energy protons/helium ions with tapered glass capillary optics for the applications of micrometer sized surface modifications and a biological tool, respectively. The transmission experiments of keV HCIs through the glass capillaries show a density enhancement of about 10, beam guiding up to 5°, and the extracted beam keeping the initial charge-state. The combination of MeV ion beams and the capillary with a thin end window at its outlet was used for the irradiation of a part of nucleus of a HeLa cell in culture solution. Escherichia coli cells are irradiated by MeV proton microbeam to determine the minimum dose to stop the single flagellar motor. Scanning irradiation of polymer surface by the beam extracted from the capillary in solution containing acrylic acid was found to provide a deposition layer with large affinity with water.

  11. Intense ion beam generator

    DOEpatents

    Humphries, Jr., Stanley; Sudan, Ravindra N.

    1977-08-30

    Methods and apparatus for producing intense megavolt ion beams are disclosed. In one embodiment, a reflex triode-type pulsed ion accelerator is described which produces ion pulses of more than 5 kiloamperes current with a peak energy of 3 MeV. In other embodiments, the device is constructed so as to focus the beam of ions for high concentration and ease of extraction, and magnetic insulation is provided to increase the efficiency of operation.

  12. Performance of positive ion based high power ion source of EAST neutral beam injector

    SciTech Connect

    Hu, Chundong; Xie, Yahong Xie, Yuanlai; Liu, Sheng; Xu, Yongjian; Liang, Lizhen; Jiang, Caichao; Li, Jun; Liu, Zhimin

    2016-02-15

    The positive ion based source with a hot cathode based arc chamber and a tetrode accelerator was employed for a neutral beam injector on the experimental advanced superconducting tokamak (EAST). Four ion sources were developed and each ion source has produced 4 MW @ 80 keV hydrogen beam on the test bed. 100 s long pulse operation with modulated beam has also been tested on the test bed. The accelerator was upgraded from circular shaped to diamond shaped in the latest two ion sources. In the latest campaign of EAST experiment, four ion sources injected more than 4 MW deuterium beam with beam energy of 60 keV into EAST.

  13. Pulsed ion beam source

    DOEpatents

    Greenly, John B.

    1996-01-01

    An improved magnetically-confined anode plasma pulsed ion beam source. Beam rotation effects and power efficiency are improved by a magnetic design which places the separatrix between the fast field flux structure and the slow field structure near the anode of the ion beam source, by a gas port design which localizes the gas delivery into the gap between the fast coil and the anode, by a pre-ionizer ringing circuit connected to the fast coil, and by a bias field means which optimally adjusts the plasma formation position in the ion beam source.

  14. Ion Beam Simulator

    SciTech Connect

    Kalvas, Taneli

    2005-11-08

    IBSimu(Ion Beam Simulator) is a computer program for making two and three dimensional ion optical simulations. The program can solve electrostatic field in a rectangular mesh using Poisson equation using Finite Difference method (FDM). The mesh can consist of a coarse and a fine part so that the calculation accuracy can be increased in critical areas of the geometry, while most of the calculation is done quickly using the coarse mesh. IBSimu can launch ion beam trajectories into the simulation from an injection surface or fomo plasma. Ion beam space charge of time independent simulations can be taken in account using Viasov iteration. Plasma is calculated by compensating space charge with electrons having Boltzmann energy distribution. The simulation software can also be used to calculate time dependent cases if the space charge is not calculated. Software includes diagnostic tools for plotting the geometry, electric field, space charge map, ion beam trajectories, emittance data and beam profiles.

  15. Ion beam accelerator system

    NASA Technical Reports Server (NTRS)

    Aston, G. (Inventor)

    1981-01-01

    A system is described that combines geometrical and electrostatic focusing to provide high ion extraction efficiency and good focusing of an accelerated ion beam. The apparatus includes a pair of curved extraction grids with multiple pairs of aligned holes positioned to direct a group of beamlets along converging paths. The extraction grids are closely spaced and maintained at a moderate potential to efficiently extract beamlets of ions and allow them to combine into a single beam. An accelerator electrode device downstream from the extraction grids is at a much lower potential than the grids to accelerate the combined beam. The application of the system to ion implantation is mentioned.

  16. Ion beam thruster shield

    NASA Technical Reports Server (NTRS)

    Power, J. L. (Inventor)

    1976-01-01

    An ion thruster beam shield is provided that comprises a cylindrical housing that extends downstream from the ion thruster and a plurality of annular vanes which are spaced along the length of the housing, and extend inwardly from the interior wall of the housing. The shield intercepts and stops all charge exchange and beam ions, neutral propellant, and sputter products formed due to the interaction of beam and shield emanating from the ion thruster outside of a fixed conical angle from the thruster axis. Further, the shield prevents the sputter products formed during the operation of the engine from escaping the interior volume of the shield.

  17. Calorimetric detection of neutral-atom content of ion beam

    NASA Technical Reports Server (NTRS)

    Roberts, A. S., Jr.

    1974-01-01

    Energy deposition technique deduces neutral-beam flux or dose from measured values of incremental resistance increases in platinum wire passed through beam. Steady-state heat balance analysis led to equivalent neutral-beam current. Method was used to detect neutral-atom content of 60-keV argon ion beam.

  18. Ion beam accelerator system

    NASA Technical Reports Server (NTRS)

    Aston, Graeme (Inventor)

    1984-01-01

    A system is described that combines geometrical and electrostatic focusing to provide high ion extraction efficiency and good focusing of an accelerated ion beam. The apparatus includes a pair of curved extraction grids (16, 18) with multiple pairs of aligned holes positioned to direct a group of beamlets (20) along converging paths. The extraction grids are closely spaced and maintained at a moderate potential to efficiently extract beamlets of ions and allow them to combine into a single beam (14). An accelerator electrode device (22) downstream from the extraction grids, is at a much lower potential than the grids to accelerate the combined beam.

  19. Ion beam surface modification

    NASA Technical Reports Server (NTRS)

    Dwight, D. W.

    1982-01-01

    The essential details of a study on the practical applications and mechanisms of polymer sputtering via Argon ion impact are summarized. The potential to modify the properties of polymer surfaces to improve their adherence, durability, biocompatibility, or other desirable properties by ion beam sputtering was emphasized. Ion beam milling can be of benefit as an analytical tool to obtain composition versus depth information. Ion impact from a directed ion gun source specifically etches polymer structures according to their morphologies, therefore this technique may be useful to study unknown or new morphological features. Factors addressed were related to: (1) the texture that arises on a polymer target after ion impact; (2) the chemistry of the top surface after ion impact; (3) the chemistry of sputtered films of polymeric material deposited on substrates placed adjacent to targets during ion impact; and (4) practical properties of textured polymer targets, specifically the wettability and adhesive bonding properties.

  20. Low energy ion beam dynamics of NANOGAN ECR ion source

    NASA Astrophysics Data System (ADS)

    Kumar, Sarvesh; Mandal, A.

    2016-04-01

    A new low energy ion beam facility (LEIBF) has been developed for providing the mass analyzed highly charged intense ion beams of energy ranging from a few tens of keV to a few MeV for atomic, molecular and materials sciences research. The new facility consists of an all permanent magnet 10 GHz electron cyclotron resonance (ECR) ion source (NANOGAN) installed on a high voltage platform (400 kV) which provides large currents of multiply charged ion beams. Higher emittance at low energy of intense ion beam puts a tremendous challenge to the beam optical design of this facility. The beam line consists of mainly the electrostatic quadrupoles, an accelerating section, analyzing cum switching magnet and suitable beam diagnostics including vacuum components. The accelerated ion beam is analyzed for a particular mass to charge (m/q) ratio as well as guided to three different lines along 75°, 90° and 105° using a large acceptance analyzing cum switching magnet. The details of transverse beam optics to all the beam lines with TRANSPORT and GICOSY beam optics codes are being described. Field computation code, OPERA 3D has been utilized to design the magnets and electrostatic quadrupoles. A theoretical estimation of emittance for optimized geometry of ion source is given so as to form the basis of beam optics calculations. The method of quadrupole scan of the beam is used to characterize the emittance of the final beam on the target. The measured beam emittance increases with m/q ratios of various ion beams similar to the trend observed theoretically.

  1. Focused ion beam system

    DOEpatents

    Leung, K.; Gough, R.A.; Ji, Q.; Lee, Y.Y.

    1999-08-31

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 {mu}m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 m or less. 13 figs.

  2. Focused ion beam system

    SciTech Connect

    Leung, K.; Gough, R.A.; Ji, Q.; Lee, Y.Y.

    1999-08-31

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 {mu}m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 m or less. 13 figs.

  3. Ion beam texturing

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.

    1976-01-01

    A microscopic surface texture is created by sputter etching a surface while simultaneously sputter depositing a lower sputter yield material onto the surface. A xenon ion beam source has been used to perform this texturing process on samples as large as three centimeters in diameter. Ion beam textured surface structures have been characterized with SEM photomicrographs for a large number of materials including Cu, Al, Si, Ti, Ni, Fe, Stainless steel, Au, and Ag. Surfaces have been textured using a variety of low sputter yield materials - Ta, Mo, Nb, and Ti. The initial stages of the texture creation have been documented, and the technique of ion beam sputter removal of any remaining deposited material has been studied. A number of other texturing parameters have been studied such as the variation of the texture with ion beam power, surface temperature, and the rate of texture growth with sputter etching time.

  4. Focused ion beam system

    DOEpatents

    Leung, Ka-Ngo; Gough, Richard A.; Ji, Qing; Lee, Yung-Hee Yvette

    1999-01-01

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 .mu.m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 .mu.m or less.

  5. Pulsed ion beam source

    DOEpatents

    Greenly, John B.

    1997-01-01

    An improved pulsed ion beam source having a new biasing circuit for the fast magnetic field. This circuit provides for an initial negative bias for the field created by the fast coils in the ion beam source which pre-ionize the gas in the source, ionize the gas and deliver the gas to the proper position in the accelerating gap between the anode and cathode assemblies in the ion beam source. The initial negative bias improves the interaction between the location of the nulls in the composite magnetic field in the ion beam source and the position of the gas for pre-ionization and ionization into the plasma as well as final positioning of the plasma in the accelerating gap. Improvements to the construction of the flux excluders in the anode assembly are also accomplished by fabricating them as layered structures with a high melting point, low conductivity material on the outsides with a high conductivity material in the center.

  6. Electromagnetic ion beam instabilities

    NASA Technical Reports Server (NTRS)

    Gary, S. P.; Foosland, D. W.; Smith, C. W.; Lee, M. A.; Goldstein, M. L.

    1984-01-01

    The linear theory of electromagnetic instabilities driven by an energetic ion beam streaming parallel to a magnetic field in a homogeneous Vlasov plasma is considered. Numerical solutions of the full dispersion equation are presented. At propagation parallel to the magnetic field, there are four distinct instabilities. A sufficiently energetic beam gives rise to two unstable modes with right-hand polarization, one resonant with the beam, the other nonresonant. A beam with sufficiently large T (perpendicular to B)/T (parallel to B) gives rise to the left-hand ion cyclotron anisotropy instability at relatively small beam velocities, and a sufficiently hot beam drives unstable a left-hand beam resonant mode. The parametric dependences of the growth rates for the three high beam velocity instabilities are presented here. In addition, some properties at oblique propagation are examined. It is demonstrated that, as the beam drift velocity is increased, relative maxima in growth rates can arise at harmonics of the ion cyclotron resonance for both right and left elliptically polarized modes.

  7. Ion-beam technologies

    SciTech Connect

    Fenske, G.R.

    1993-01-01

    This compilation of figures and diagrams reviews processes for depositing diamond/diamond-like carbon films. Processes addressed are chemical vapor deposition (HFCVD, PACVD, etc.), plasma vapor deposition (plasma sputtering, ion beam sputtering, evaporation, etc.), low-energy ion implantation, and hybrid processes (biased sputtering, IBAD, biased HFCVD, etc.). The tribological performance of coatings produced by different means is discussed.

  8. An innovative experimental setup for the measurement of sputtering yield induced by keV energy ions

    NASA Astrophysics Data System (ADS)

    Salou, P.; Lebius, H.; Benyagoub, A.; Langlinay, T.; Lelièvre, D.; Ban-d'Etat, B.

    2013-09-01

    An innovative experimental equipment allowing to study the sputtering induced by ion beam irradiation is presented. The sputtered particles are collected on a catcher which is analyzed in situ by Auger electron spectroscopy without breaking the ultra high vacuum (less than 10-9 mbar), avoiding thus any problem linked to possible contamination. This method allows to measure the angular distribution of sputtering yield. It is now possible to study the sputtering of many elements such as carbon based materials. Preliminary results are presented in the case of highly oriented pyrolytic graphite and tungsten irradiated by an Ar+ beam at 2.8 keV and 7 keV, respectively.

  9. An innovative experimental setup for the measurement of sputtering yield induced by keV energy ions.

    PubMed

    Salou, P; Lebius, H; Benyagoub, A; Langlinay, T; Lelièvre, D; Ban-d'Etat, B

    2013-09-01

    An innovative experimental equipment allowing to study the sputtering induced by ion beam irradiation is presented. The sputtered particles are collected on a catcher which is analyzed in situ by Auger electron spectroscopy without breaking the ultra high vacuum (less than 10(-9) mbar), avoiding thus any problem linked to possible contamination. This method allows to measure the angular distribution of sputtering yield. It is now possible to study the sputtering of many elements such as carbon based materials. Preliminary results are presented in the case of highly oriented pyrolytic graphite and tungsten irradiated by an Ar(+) beam at 2.8 keV and 7 keV, respectively.

  10. Ion beam generating apparatus

    DOEpatents

    Brown, Ian G.; Galvin, James

    1987-01-01

    An ion generating apparatus utilizing a vacuum chamber, a cathode and an anode in the chamber. A source of electrical power produces an arc or discharge between the cathode and anode. The arc is sufficient to vaporize a portion of the cathode to form a plasma. The plasma is directed to an extractor which separates the electrons from the plasma, and accelerates the ions to produce an ion beam.

  11. Progress toward a microsecond duration, repetitively pulsed, intense- ion beam

    SciTech Connect

    Davis, H.A.; Olson, J.C.; Reass, W.A.; Coates, D.M.; Hunt, J.W.; Schleinitz, H.M.; Lovberg, R.H.; Greenly, J.B.

    1996-07-01

    A number of intense ion beams applications are emerging requiring repetitive high-average-power beams. These applications include ablative deposition of thin films, rapid melt and resolidification for surface property enhancement, advanced diagnostic neutral beams for the next generation of Tokamaks, and intense pulsed-neutron sources. We are developing a 200-250 keV, 15 kA, 1 {mu}s duration, 1-30 Hz intense ion beam accelerator to address these applications.

  12. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    DOE PAGES

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; ...

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  13. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    SciTech Connect

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; Vizkelethy, Gyorgy; Abraham, John B. S.; Doyle, Barney L.

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  14. Plasma ion sources and ion beam technology inmicrofabrications

    SciTech Connect

    Ji, Lili

    2007-01-01

    For over decades, focused ion beam (FIB) has been playing a very important role in microscale technology and research, among which, semiconductor microfabrication is one of its biggest application area. As the dimensions of IC devices are scaled down, it has shown the need for new ion beam tools and new approaches to the fabrication of small-scale devices. In the meanwhile, nanotechnology has also deeply involved in material science research and bioresearch in recent years. The conventional FIB systems which utilize liquid gallium ion sources to achieve nanometer scale resolution can no longer meet the various requirements raised from such a wide application area such as low contamination, high throughput and so on. The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. In this thesis, three novel ion beam tools have been developed and investigated as the alternatives for the conventional FIB systems in some particular applications. An integrated focused ion beam (FIB) and scanning electron microscope (SEM) system has been developed for direct doping or surface modification. This new instrument employs a mini-RF driven plasma source to generate focused ion beam with various ion species, a FEI two-lens electron (2LE) column for SEM imaging, and a five-axis manipulator system for sample positioning. An all-electrostatic two-lens column has been designed to focus the ion beam extracted from the source. Based on the Munro ion optics simulation, beam spot sizes as small as 100 nm can be achieved at beam energies between 5 to 35 keV if a 5 μm-diameter extraction aperture is used. Smaller beam spot sizes can be obtained with smaller apertures at sacrifice of some beam current. The FEI 2LE column, which utilizes Schottky emission, electrostatic focusing optics, and stacked-disk column construction, can provide high-resolution (as small as 20 nm) imaging capability, with fairly long working distance (25

  15. Ion beam lithography system

    DOEpatents

    Leung, Ka-Ngo

    2005-08-02

    A maskless plasma-formed ion beam lithography tool provides for patterning of sub-50 nm features on large area flat or curved substrate surfaces. The system is very compact and does not require an accelerator column and electrostatic beam scanning components. The patterns are formed by switching beamlets on or off from a two electrode blanking system with the substrate being scanned mechanically in one dimension. This arrangement can provide a maskless nano-beam lithography tool for economic and high throughput processing.

  16. Nonpropulsive applications of ion beams

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.

    1976-01-01

    Eight centimeter ion beam sources utilizing xenon and argon have been developed that operate over a wide range of beam energies and currents. Three types of processes have been studied: sputter deposition, ion beam machining, and ion beam surface texturing. The broad range of source operating conditions allows optimum sputter deposition of various materials. An ion beam source was used to ion mill laser reflection holograms using photoresist patterns on silicon. Ion beam texturing was tried with many materials and has a multitude of potential applications.

  17. Pulsed ion beam source

    DOEpatents

    Greenly, J.B.

    1997-08-12

    An improved pulsed ion beam source is disclosed having a new biasing circuit for the fast magnetic field. This circuit provides for an initial negative bias for the field created by the fast coils in the ion beam source which pre-ionize the gas in the source, ionize the gas and deliver the gas to the proper position in the accelerating gap between the anode and cathode assemblies in the ion beam source. The initial negative bias improves the interaction between the location of the nulls in the composite magnetic field in the ion beam source and the position of the gas for pre-ionization and ionization into the plasma as well as final positioning of the plasma in the accelerating gap. Improvements to the construction of the flux excluders in the anode assembly are also accomplished by fabricating them as layered structures with a high melting point, low conductivity material on the outsides with a high conductivity material in the center. 12 figs.

  18. Ion-beam etching enhances adhesive bonding

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Mirtich, M. J.; Sovey, J. S.

    1980-01-01

    Metals and fluoropolymers exposed to 0.5 to 1.0 keV argon ions at current densities of 0.2 to 1.5 mA/sq cm develop surface texturing that increases tensile and shear strength of epoxy bonds. Bonds are 46 to 100 percent stronger than those of chemically etched surfaces. Metals require 3 to 4 hours of bombardment to become properly textured. Fluoropolymers require 5 seconds to 30 minutes. Ion beam will not texture nickel. Unlike chemical treatments, bonding of fluoropolymers can be done days or months after ion treatment.

  19. Fermilab HINS Proton Ion Source Beam Measurements

    SciTech Connect

    Tam, W.M.; Apollinari, G.; Chaurize, S.; Hays, S.; Romanov, G.; Scarpine, V.; Schmidt, C.; Webber, R.; /Fermilab

    2009-05-01

    The proton ion source for the High Intensity Neutrino Source (HINS) Linac front-end at Fermilab has been successfully commissioned. It produces a 50 keV, 3 msec beam pulse with a peak current greater than 20mA at 2.5Hz. The beam is transported to the radio-frequency quadrupole (RFQ) by a low energy beam transport (LEBT) that consists of two focusing solenoids, four steering dipole magnets and a beam current transformer. To understand beam transmission through the RFQ, it is important to characterize the 50 keV beam before connecting the LEBT to the RFQ. A wire scanner and a Faraday cup are temporarily installed at the exit of the LEBT to study the beam parameters. Beam profile measurements are made for different LEBT settings and results are compared to those from computer simulations. In lieu of direct emittance measurements, solenoid variation method based on profile measurements is used to reconstruct the beam emittance.

  20. Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens

    NASA Astrophysics Data System (ADS)

    Germer, S.; Pietag, F.; Polak, J.; Arnold, T.

    2016-11-01

    This study presents the imaging and characterization of low-current ion beams in the neutralized state monitored via single crystal YAG:Ce (Y3Al5O12) scintillators. To validate the presented beam diagnostic tool, Faraday cup measurements and test etchings were performed. Argon ions with a typical energy of 1.0 keV were emitted from an inductively coupled radio-frequency (13.56 MHz) ion beam source with total currents of some mA. Different beam properties, such as, lateral ion current density, beam divergence angle, and current density in pulsed ion beams have been studied to obtain information about the spatial beam profile and the material removal rate distribution. We observed excellent imaging properties with the scintillation screen and achieved a detailed characterization of the neutralized ion beam. A strong correlation between the scintillator light output, the ion current density, and the material removal rate could be observed.

  1. The production and sputtering of S2 by keV ion bombardment

    NASA Technical Reports Server (NTRS)

    Boring, J. W.; Chrisey, D. B.; Oshaughnessy, D. J.; Phipps, J. A.; Zhao, N.

    1986-01-01

    The ion bombardment of S-containing molecules in comets is simulated experimentally. Mass-analyzed 30-keV beams of Ar(+) and He(+) are directed at solid S, H2S, and CS2 targets at temperatures 15 K, and the neutral molecular species produced are ionized and analyzed using a quadrupole mass spectrometer. The dominant species detected are S1 and S2 for the S target, H2S and S2 for the H2S target, and S, CS, S2, and CS2 for the CS2 target. In the latter case, it is found that after about 10 to the 14th He(+) ions/sq cm have struck the target, further sputtering is prevented by formation of a dark brown deposit which is stable at room temperature; the residue forms more slowly when Ar(+) ions are used. These results, indicating relatively efficient S2 production by ion bombardment, are applied to theoretical models of S2 production and/or ejection by solar-wind, solar-flare, or cosmic-ray ions striking comets. It is found that direct solar-wind production of S2 by sputtering is unlikely at realistic bombardment rates, but that H2S-S2 conversion by energetic ions could be significant, with less stringent ice-temperature and irradiation-flux constraints than in the case of S2 production by photons.

  2. Negative ions as a source of low energy neutral beams

    SciTech Connect

    Fink, J.H.

    1980-01-01

    Little consideration has been given to the impact of recent developments in negative ion source technology on the design of low energy neutral beam injectors. However, negative ion sources of improved operating efficiency, higher gas efficiency, and smaller beam divergence will lead to neutral deuterium injectors, operating at less than 100 keV, with better operating efficiencies and more compact layouts than can be obtained from positive ion systems.

  3. Introduction to Ion Beam Therapy

    SciTech Connect

    Martisikova, Maria

    2010-01-05

    Presently, ion beam therapy reaches an increasing interest within the field of radiation therapy, which is caused by the promising clinical results obtained in the last decades. Ion beams enable higher dose conformation to the tumor and increased sparing of the surrounding tissue in comparison to the standard therapy using high energy photons. Heavy ions, like carbon, offer in addition increased biological effectiveness, which makes them suitable for treatment of radioresistant tumors. This contribution gives an overview over the physical and biological properties of ion beams. Common fundamental principles of ion beam therapy are summarized and differences between standard therapy with high energy photons, proton and carbon ion therapy are discussed. The technologies used for the beam production and delivery are introduced, with emphasis to the differences between passive and active beam delivery systems. The last part concentrates on the quality assurance in ion therapy. Specialties of dosimetry in medical ion beams are discussed.

  4. Ion beam sputter etching

    NASA Technical Reports Server (NTRS)

    Banks, Bruce A.; Rutledge, Sharon K.

    1986-01-01

    An ion beam etching process which forms extremely high aspect ratio surface microstructures using thin sputter masks is utilized in the fabrication of integrated circuits. A carbon rich sputter mask together with unmasked portions of a substrate is bombarded with inert gas ions while simultaneous carbon deposition occurs. The arrival of the carbon deposit is adjusted to enable the sputter mask to have a near zero or even slightly positive increase in thickness with time while the unmasked portions have a high net sputter etch rate.

  5. Ion beam analysis

    SciTech Connect

    Robertson, J.D. )

    1990-01-01

    A new ion beam analysis facility has recently been installed at a Van de Graaff accelerator. Its use is expected to support many energy and environmental research projects. Material composition and spatial distribution analyses at the facility are based upon Rutherford backscattering spectrometry, particle-induced X-ray emission, and particle-induced gamma-ray emission analysis. An overview of these three techniques is presented in this article.

  6. Stability of colliding ion beams

    SciTech Connect

    Foote, E.A.; Kulsrud, R.M.

    1980-11-01

    We determine conditions for stability of two identical colliding ion beams in the presence of neutralizing electrons, but no background ions. Such a situation is envisioned for the Counterstreaming Ion Torus. The ion beams are taken to be Maxwellian in their frames of reference. The approximation of electrostatic and electromagnetic modes is made. The stability of the electrostatic modes depends on the relation between the ion electron temperature ratio and the relative beam velocities. The stability of the electromagnetic mode depends on the relation between the ion plasma ..beta.. and the relative beam velocities.

  7. Radiation vulcanization of natural rubber latex using 250 keV electron beam machine

    NASA Astrophysics Data System (ADS)

    Chirinos, H.; Yoshii, F.; Makuuchi, K.; Lugao, A.

    2003-08-01

    The sensitized radiation vulcanization of natural rubber latex has been carried out with 250 keV electrons. Latex was irradiated over a range of the beam current from 5 to 20 mA in the presence of sensitizers like the n-butyl acrylate ( n-BA). The vulcanization dose decreases with increasing beam current condition. The rate of vulcanization ( Rvul) depends on the beam current ( I) as given by the equation Rvul= kI0.6.

  8. Ion source development for the proposed FNAL 750keV injector upgrade

    SciTech Connect

    Bollinger, D.S.; /Fermilab

    2010-11-01

    Currently there is a Proposed FNAL 750keV Injector Upgrade for the replacement of the 40 year old Fermi National Laboratory (FNAL) Cockcroft-Walton accelerators with a new ion source and 200MHz Radio Frequency Quadruple (RFQ). The slit type magnetron being used now will be replaced with a round aperture magnetron similar to the one used at Brookhaven National Lab (BNL). Operational experience from BNL has shown that this type of source is more reliable with a longer lifetime due to better power efficiency. The current source development effort is to produce a reliable source with >60mA of H- beam current, 15Hz rep-rate, 100s pulse width, and a duty factor of 0.15%. The source will be based on the BNL design along with development done at FNAL for the High Intensity Neutrino Source (HINS).

  9. Ions beams and ferroelectric plasma sources

    NASA Astrophysics Data System (ADS)

    Stepanov, Anton

    Near-perfect space-charge neutralization is required for the transverse compression of high perveance ion beams for ion-beam-driven warm dense matter experiments, such as the Neutralized Drift Compression eXperiment (NDCX). Neutralization can be accomplished by introducing a plasma in the beam path, which provides free electrons that compensate the positive space charge of the ion beam. In this thesis, charge neutralization of a 40 keV, perveance-dominated Ar+ beam by a Ferroelectric Plasma Source (FEPS) is investigated. First, the parameters of the ion beam, such as divergence due to the extraction optics, charge neutralization fraction, and emittance were measured. The ion beam was propagated through the FEPS plasma, and the effects of charge neutralization were inferred from time-resolved measurements of the transverse beam profile. In addition, the dependence of FEPS plasma parameters on the configuration of the driving pulser circuit was studied to optimize pulser design. An ion accelerator was constructed that produced a 30-50 keV Ar + beam with pulse duration <300 mus and dimensionless perveance Q up to 8 x 10-4. Transverse profile measurements 33 cm downstream of the ion source showed that the dependence of beam radius on Q was consistent with space charge expansion. It was concluded that the beam was perveance-dominated with a charge neutralization fraction of approximately zero in the absence of neutralizing plasma. Since beam expansion occurred primarily due to space charge, the decrease in effective perveance due to neutralization by FEPS plasma can be inferred from the reduction in beam radius. Results on propagation of the ion beam through FEPS plasma demonstrate that after the FEPS is triggered, the beam radius decreases to its neutralized value in about 5 mus. The duration of neutralization was about 10 mus at a charging voltage VFEPS = 5.5 kV and 35 mus at VFEPS = 6.5 kV. With VFEPS = 6.5 kV, the transverse current density profile 33 cm downstream

  10. Fast ion beam-plasma interaction system.

    PubMed

    Breun, R A; Ferron, J R

    1979-07-01

    A device has been constructed for the study of the interaction between a fast ion beam and a target plasma of separately controllable parameters. The beam of either hydrogen or helium ions has an energy of 1-4 keV and a total current of 0.5-2 A. The beam energy and beam current can be varied separately. The ion source plasma is created by a pulsed (0.2-10-ms pulse length) discharge in neutral gas at up to 3 x 10(-3) Torr. The neutrals are pulsed into the source chamber, allowing the neutral pressure in the target region to remain less than 5 x 10(-5) Torr at a 2-Hz repetition rate. The creation of the source plasma can be described by a simple set of equations which predict optimum source design parameters. The target plasma is also produced by a pulsed discharge. Between the target and source chambers the beam is neutralized by electrons drawn from a set of hot filaments. Currently under study is an unstable wave in a field-free plasma excited when the beam velocity is nearly equal to the target electron thermal velocity (v(beam) approximately 3.5 x 10(7) cm/s, Te = 0.5 eV).

  11. Heavy ion beam probing

    SciTech Connect

    Hickok, R L

    1980-07-01

    This report consists of the notes distributed to the participants at the IEEE Mini-Course on Modern Plasma Diagnostics that was held in Madison, Wisconsin in May 1980. It presents an overview of Heavy Ion Beam Probing that briefly describes the principles and discuss the types of measurements that can be made. The problems associated with implementing beam probes are noted, possible variations are described, estimated costs of present day systems, and the scaling requirements for large plasma devices are presented. The final chapter illustrates typical results that have been obtained on a variety of plasma devices. No detailed calculations are included in the report, but a list of references that will provide more detailed information is included.

  12. Ion beams for materials analysis

    SciTech Connect

    Bird, J.R.; Williams, J.S.

    1988-01-01

    The contents of this book are: Concepts and Principles of Ion Beam Analysis; Overview of Techniques and Equipment; High Energy Ion Scattering Spectrometry; Nuclear Reactions. Ion Induced X-Ray Emission; Channeling; Depth Profiling of Surface Layers During Ion Bombardment; Low Energy Ion Scattering from Surfaces and Interfaces; Microprobe Analysis; and Critical Assessment of Analysis Capabilities.

  13. Interaction of 18-keV O{sup -} ions with Al{sub 2}O{sub 3} nanocapillaries

    SciTech Connect

    Sun Guangzhi; Chen Ximeng; Wang Jun; Chen Yifeng; Xu Junkui; Zhou Chunlin; Shao Jianxiong; Cui Ying; Ding Baowei; Yin Yongzhi; Wang Xinan; Lou Fengjun; Lv Xueyang; Qiu Xiyu; Jia Juanjuan; Chen Lin; Xi Fayuan; Chen Zichun; Li Lanting; Liu Zhaoyuan

    2009-05-15

    The transmission of 18-keV O{sup -} ions through Al{sub 2}O{sub 3} nanocapillaries with 50 nm in diameter and 12 {mu}m in length is studied in this work. By measuring angular distribution of transmitted particles when capillaries were tilted with respect to incident ion beam, two peaks were observed. It is distinguished that one of them is composed by direct transmitted ions and another one is composed by scattered ions. A phenomenon referred to as guiding effect, as found for highly charged ions and low-energy electrons, was observed. When negative ions (18-keV O{sup -}) are transmitted through nanocapillaries, most of them were ionized to neutral atoms and even positive ions. The intensity of transmitted particles (O{sup -}, O{sup 0}, and O{sup +}) decreased when the tilt angle increased. In transmitted particles, the fraction of O{sup -} declined but that of O{sup 0} and O{sup +} ions grew when the tilt angle grew. Both elastic collision and electrostatic scattering were found in scattered ions.

  14. An innovative experimental setup for the measurement of sputtering yield induced by keV energy ions

    SciTech Connect

    Salou, P.; Lebius, H.; Benyagoub, A.; Langlinay, T.; Lelièvre, D.; Ban-d’Etat, B.

    2013-09-15

    An innovative experimental equipment allowing to study the sputtering induced by ion beam irradiation is presented. The sputtered particles are collected on a catcher which is analyzed in situ by Auger electron spectroscopy without breaking the ultra high vacuum (less than 10{sup −9} mbar), avoiding thus any problem linked to possible contamination. This method allows to measure the angular distribution of sputtering yield. It is now possible to study the sputtering of many elements such as carbon based materials. Preliminary results are presented in the case of highly oriented pyrolytic graphite and tungsten irradiated by an Ar{sup +} beam at 2.8 keV and 7 keV, respectively.

  15. Rutherford Backscattering Spectrometry studies of 100 keV nitrogen ion implanted polypropylene polymer

    NASA Astrophysics Data System (ADS)

    Chawla, Mahak; Aggarwal, Sanjeev; Sharma, Annu

    2017-09-01

    The effect of nitrogen ion implantation on the structure and composition in polypropylene (PP) polymer has been studied. Implantation was carried out using 100 keV N+ ions at different fluences of 1 × 1015, 1 × 1016 and 1 × 1017 ions cm-2 with beam current density of ∼0.65 μA cm-2. Surface morphological changes in the pre- and post-implanted PP specimens have been studied using Rutherford Backscattering Spectrometry (RBS) and UV-Visible Spectroscopy. The spatial distribution of implantation induced modification in the form of carbonization and dehydrogenation in the near surface region of PP matrix, the projected range, retained dose of implanted nitrogen, the various elements present in the implanted layers and their differential cross-sections have been analyzed using RBS spectra. RUMP simulation yielded an increase in the concentration of carbon near the surface from 33 at.% (virgin) to 42 at.% at fluence of 1 × 1017 N+ cm-2. Further, optical absorption has been found to increase with a shift in the absorption edge from UV towards visible region with increasing fluence. UV-Vis absorption spectra also indicate a drastic decrease in optical energy gap from 4.12 eV (virgin) to 0.25 eV (1 × 1017 N+ cm-2) indicating towards the formation of carbonaceous network in the implanted region. All these changes observed using UV-Visible have been further correlated with the outcomes of the RBS characterization.

  16. Neutralized ion beam modification of cellulose membranes for study of ion charge effect on ion-beam-induced DNA transfer

    NASA Astrophysics Data System (ADS)

    Prakrajang, K.; Sangwijit, K.; Anuntalabhochai, S.; Wanichapichart, P.; Yu, L. D.

    2012-02-01

    Low-energy ion beam biotechnology (IBBT) has recently been rapidly developed worldwide. Ion-beam-induced DNA transfer is one of the important applications of IBBT. However, mechanisms involved in this application are not yet well understood. In this study plasma-neutralized ion beam was applied to investigate ion charge effect on induction of DNA transfer. Argon ion beam at 7.5 keV was neutralized by RF-driven plasma in the beam path and then bombarded cellulose membranes which were used as the mimetic plant cell envelope. Electrical properties such as impedance and capacitance of the membranes were measured after the bombardment. An in vitro experiment on plasmid DNA transfer through the cellulose membrane was followed up. The results showed that the ion charge input played an important role in the impedance and capacitance changes which would affect DNA transfer. Generally speaking, neutral particle beam bombardment of biologic cells was more effective in inducing DNA transfer than charged ion beam bombardment.

  17. An ion beam deceleration lens for ultra-low-energy ion bombardment of naked DNA

    NASA Astrophysics Data System (ADS)

    Thopan, P.; Prakrajang, K.; Thongkumkoon, P.; Suwannakachorn, D.; Yu, L. D.

    2013-07-01

    Study of low-energy ion bombardment effect on biological living materials is of significance. High-energy ion beam irradiation of biological materials such as organs and cells has no doubt biological effects. However, ion energy deposition in the ion-bombarded materials dominantly occurs in the low-energy range. To investigate effects from very-low-energy ion bombardment on biological materials, an ion beam deceleration lens is necessary for uniform ion energy lower than keV. A deceleration lens was designed and constructed based on study of the beam optics using the SIMION program. The lens consisted of six electrodes, able to focus and decelerate primary ion beam, with the last one being a long tube to obtain a parallel uniform exiting beam. The deceleration lens was installed to our 30-kV bioengineering-specialized ion beam line. The final decelerated-ion energy was measured using a simple electrostatic field to bend the beam to range from 10 eV to 1 keV controlled by the lens parameters and the primary beam condition. In a preliminary test, nitrogen ion beam at 60 eV decelerated from a primary 20-keV beam bombarded naked plasmid DNA. The original DNA supercoiled form was found to change to relaxed and linear forms, indicating single or double strand breaks. The study demonstrated that the ion bombardment with energy as low as several-tens eV was possible to break DNA strands and thus potential to cause genetic modification of biological cells.

  18. Energy Amplification and Beam Bunching in a Pulse Line Ion Accelerator

    SciTech Connect

    Roy, P K; Waldron, W L; Yu, S S; Coleman, J E; Henestroza, E; Grote, D P; Baca, D; Bieniosek, F M; Briggs, R J; Davidson, R C; Eylon, S; Friedman, A; Greenway, W G; Leitner, M; Logan, G B; Reginato, L L; Seidl, P A

    2006-06-08

    In a first beam dynamics validation experiment for a new Pulse Line Ion Acceleration (PLIA) concept, the predicted energy amplification and beam bunching were experimentally observed. Beam energy modulation of -80 keV to +150 keV was measured using a PLIA input voltage waveform of -21 kV to +12 kV. Ion pulses accelerated by 150 keV, and bunching by a factor of four were simultaneously achieved. The measured longitudinal phase space and current waveform of the accelerated beam are in good agreement with 3-D particle-in-cell simulations.

  19. A compact, versatile low-energy electron beam ion source

    SciTech Connect

    Zschornack, G.; König, J.; Schmidt, M.; Thorn, A.

    2014-02-15

    A new compact Electron Beam Ion Source, the Dresden EBIT-LE, is introduced as an ion source working at low electron beam energies. The EBIT-LE operates at an electron energy ranging from 100 eV to some keV and can easily be modified to an EBIT also working at higher electron beam energies of up to 15 keV. We show that, depending on the electron beam energy, electron beam currents from a few mA in the low-energy regime up to about 40 mA in the high-energy regime are possible. Technical solutions as well as first experimental results of the EBIT-LE are presented. In ion extraction experiments, a stable production of low and intermediate charged ions at electron beam energies below 2 keV is demonstrated. Furthermore, X-ray spectroscopy measurements confirm the possibility of using the machine as a source of X-rays from ions excited at low electron energies.

  20. A compact, versatile low-energy electron beam ion source.

    PubMed

    Zschornack, G; König, J; Schmidt, M; Thorn, A

    2014-02-01

    A new compact Electron Beam Ion Source, the Dresden EBIT-LE, is introduced as an ion source working at low electron beam energies. The EBIT-LE operates at an electron energy ranging from 100 eV to some keV and can easily be modified to an EBIT also working at higher electron beam energies of up to 15 keV. We show that, depending on the electron beam energy, electron beam currents from a few mA in the low-energy regime up to about 40 mA in the high-energy regime are possible. Technical solutions as well as first experimental results of the EBIT-LE are presented. In ion extraction experiments, a stable production of low and intermediate charged ions at electron beam energies below 2 keV is demonstrated. Furthermore, X-ray spectroscopy measurements confirm the possibility of using the machine as a source of X-rays from ions excited at low electron energies.

  1. Ion Beam Modification of Materials

    SciTech Connect

    Averback, B; de la Rubia, T D; Felter, T E; Hamza, A V; Rehn, L E

    2005-10-10

    This volume contains the proceedings of the 14th International Conference on Ion Beam Modification of Materials, IBMM 2004, and is published by Elsevier-Science Publishers as a special issue of Nuclear Instruments and Methods B. The conference series is the major international forum to present and discuss recent research results and future directions in the field of ion beam modification, synthesis and characterization of materials. The first conference in the series was held in Budapest, Hungary, 1978, and subsequent conferences were held every two years at locations around the Globe, most recently in Japan, Brazil, and the Netherlands. The series brings together physicists, materials scientists, and ion beam specialists from all over the world. The official conference language is English. IBMM 2004 was held on September 5-10, 2004. The focus was on materials science involving both basic ion-solid interaction processes and property changes occurring either during or subsequent to ion bombardment and ion beam processing in relation to materials and device applications. Areas of research included Nanostructures, Multiscale Modeling, Patterning of Surfaces, Focused Ion Beams, Defects in Semiconductors, Insulators and Metals, Cluster Beams, Radiation Effects in Materials, Photonic Devices, Ion Implantation, Ion Beams in Biology and Medicine including New Materials, Imaging, and Treatment.

  2. Ion recombination correction in carbon ion beams.

    PubMed

    Rossomme, S; Hopfgartner, J; Lee, N D; Delor, A; Thomas, R A S; Romano, F; Fukumura, A; Vynckier, S; Palmans, H

    2016-07-01

    In this work, ion recombination is studied as a function of energy and depth in carbon ion beams. Measurements were performed in three different passively scattered carbon ion beams with energies of 62 MeV/n, 135 MeV/n, and 290 MeV/n using various types of plane-parallel ionization chambers. Experimental results were compared with two analytical models for initial recombination. One model is generally used for photon beams and the other model, developed by Jaffé, takes into account the ionization density along the ion track. An investigation was carried out to ascertain the effect on the ion recombination correction with varying ionization chamber orientation with respect to the direction of the ion tracks. The variation of the ion recombination correction factors as a function of depth was studied for a Markus ionization chamber in the 62 MeV/n nonmodulated carbon ion beam. This variation can be related to the depth distribution of linear energy transfer. Results show that the theory for photon beams is not applicable to carbon ion beams. On the other hand, by optimizing the value of the ionization density and the initial mean-square radius, good agreement is found between Jaffé's theory and the experimental results. As predicted by Jaffé's theory, the results confirm that ion recombination corrections strongly decrease with an increasing angle between the ion tracks and the electric field lines. For the Markus ionization chamber, the variation of the ion recombination correction factor with depth was modeled adequately by a sigmoid function, which is approximately constant in the plateau and strongly increasing in the Bragg peak region to values of up to 1.06. Except in the distal edge region, all experimental results are accurately described by Jaffé's theory. Experimental results confirm that ion recombination in the investigated carbon ion beams is dominated by initial recombination. Ion recombination corrections are found to be significant and cannot be

  3. Effect of 800 keV argon ions pre-damage on the helium blister formation of tungsten exposed to 60 keV helium ions

    NASA Astrophysics Data System (ADS)

    Chen, Zhe; Han, Wenjia; Yu, Jiangang; Zhu, Kaigui

    2016-04-01

    This study aims to investigate the effect of Ar8+ ions pre-damage on the following He2+ irradiation behavior of polycrystalline tungsten. We compared the irradiation resistance performance against 60 keV He2+ ions of undamaged tungsten samples with that of pre-damaged samples which were preliminarily exposed to 800 keV Ar8+ ions at a fluence of 4 × 1019 ions m-2. The experimental results indicate that the helium blistering of tungsten could be effectively relieved by the Ar8+ ions pre-damage, while the retention of helium around low energy desorption sites in the pre-damaged tungsten was larger than that of the undamaged samples. A strong orientation dependence of blistering had been observed, with the blister occurred preferentially on the surface of grains with normal direction close to <111>. The Ar8+ ions irradiation-induced damage altered the morphology of helium bubbles in tungsten exposed to the following He2+ irradiation significantly. The intensity of helium release peaks at relatively low temperatures (<600 K) was enhanced due to Ar8+ ions pre-damage.

  4. RF conditioning and beam experiments on 400 keV RFQ accelerator at BARC

    SciTech Connect

    Gupta, Shrikrishna; Rao, S.V.L.S.; Kumar, Rajesh; and others

    2014-07-01

    A 400 keV Radio-frequency quadrupole accelerator (RFQ) has been designed, developed and tested at BARC. This will be used as a neutron generator (via D-T reaction). The RFQ operates at a resonant frequency of 350 MHz and needs an RF power of ∼ 60 kW to accelerate the deuteron beam to 400 keV within a length of 1.03 m. Though the RFQ is designed for deuteron beam, it was tested by accelerating both the proton and deuteron beams to their designed values of 200 and 400 keV respectively. The proton and deuteron beam experiments required peak RF power of approx. 15 kW and 60 kW respectively at 350 MHz. The RF power from the tetrode amplifier and coaxial transmission lines is coupled to the cavity by a coaxial loop coupler. As the coupler and cavity operated at vacuum of better than 2e-6 torr, extensive RF conditioning of the cavity and coupler was performed to reach at the desired power levels. (author)

  5. Ion beam probe diagnostic system

    NASA Astrophysics Data System (ADS)

    Hickok, R. L.; Jennings, W. C.; Woo, J. T.; Connor, K. A.

    1980-07-01

    Tokomak plasmas suitable for diagnostic development were produced in RENTOR following technological improvements in the vacuum chamber and discharge cleaning systems. Secondary ion signals were obtained from the heavy ion beam probe on RENTOR leading to initial estimates of the plasma space potential, which appears to vary by several hundred volts during the plasma pulse. The principle of measuring space potential in a minimum-B geometry was established using an ion gun mounted at the center of the ALEX baseball coil. The neutral beam probe was installed for measuring the space potential using actual secondary ion signals from a hollow cathode arc in ALEX and preliminary tests have begun. The ion beam test stand was significantly altered to allow more flexibility in testing energy analyzers, ion guns, and ion focusing concepts.

  6. Electron beam ion source and electron beam ion trap (invited).

    PubMed

    Becker, Reinard; Kester, Oliver

    2010-02-01

    The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not "sorcery" but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.

  7. Ion beam sputtering of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Sovey, J. S.

    1978-01-01

    Etching and deposition of fluoropolymers are of considerable industrial interest for applications dealing with adhesion, chemical inertness, hydrophobicity, and dielectric properties. This paper describes ion beam sputter processing rates as well as pertinent characteristics of etched targets and films. An argon ion beam source was used to sputter etch and deposit the fluoropolymers PTFE, FEP, and CTFE. Ion beam energy, current density, and target temperature were varied to examine effects on etch and deposition rates. The ion etched fluoropolymers yield cone or spire-like surface structures which vary depending upon the type of polymer, ion beam power density, etch time, and target temperature. Also presented are sputter target and film characteristics which were documented by spectral transmittance measurements, X-ray diffraction, ESCA, and SEM photomicrographs.

  8. Ultra Cold Photoelectron Beams for Ion Storage Rings

    SciTech Connect

    Orlov, D. A.; Krantz, C.; Shornikov, A.; Lestinsky, M.; Hoffmann, J.; Wolf, A.; Jaroshevich, A. S.; Kosolobov, S. N.; Terekhov, A. S.

    2009-08-04

    An ultra cold electron target with a cryogenic GaAs photocathode source, developed for the Heidelberg TSR, delivers electron currents up to a few mA with typical kinetic energies of few keV and provides unprecedented energy resolution below 1 meV for electron-ion recombination merged-beam experiments. For the new generation of low-energy electrostatic storage rings, cold electron beams from a photocathode source can bring additional benefits, improving the cooling efficiency of stored ions and making it possible to cool even heavy, slow molecules by electron beams of energies of only a few eV or even below.

  9. A microwave beam waveguide undulator for a brilliant above 100 keV photon source.

    SciTech Connect

    Kang, Y. W.

    1999-04-19

    For generation of photons above 100-keV with a magnetic field strength in the range 0.2-0.5 Tesla, an undulator wavelength {lambda}{sub u} shorter than 5 mm may be needed with beam in the Advanced Photon Source (APS) storage ring. A microwave beam waveguide undulator system has been investigated for generation of such light. The waveguide structure consists of two parallel reflector surfaces that can be derived from an elliptically cylindrical waveguide. The structure can support deflecting TE{sub m0} modes with very low microwave loss. A microwave ring resonator circuit employing the beam waveguide is considered to construct an undulator with the above requirement. Microwave properties of the beam waveguide structure have been investigated, and the design criteria for a microwave undulator are discussed.

  10. Experimental study of interactions of highly charged ions with atoms at keV energies. Progress report, February 16, 1993--April 15, 1994

    SciTech Connect

    Kostroun, V.O.

    1994-04-27

    Experimental study of low energy, highly charged ions with other atomic species requires an advanced ion source such as an electron beam ion source, EBIS or an electron cyclotron ion source, ECRIS. Five years ago we finished the design and construction of the Cornell superconducting solenoid, cryogenic EBIS (CEBIS). Since then, this source has been in continuous operation in a program whose main purpose is the experimental study of interactions of highly charged ions with atoms at keV energies. This progress report for the period February 16, 1993 to April 15, 1994 describes the work accomplished during this time in the form of short abstracts.

  11. Applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Gelerinter, E.; Spielberg, N.

    1980-01-01

    Wire adhesion in steel belted radial tires; carbon fibers and composite; cold welding, brazing, and fabrication; hydrogen production, separation, and storage; membrane use; catalysis; sputtering and texture; and ion beam implantation are discussed.

  12. New ion source for KSTAR neutral beam injection system.

    PubMed

    Kim, Tae-Seong; Jeong, Seung Ho; In, Sang-Ryul

    2012-02-01

    The neutral beam injection system (NBI-1) of the KSTAR tokamak can accommodate three ion sources; however, it is currently equipped with only one prototype ion source. In the 2010 and 2011 KSTAR campaigns, this ion source supplied deuterium neutral beam power of 0.7-1.6 MW to the KSTAR plasma with a beam energy of 70-100 keV. A new ion source will be prepared for the 2012 KSTAR campaign with a much advanced performance compared with the previous one. The newly designed ion source has a very large transparency (∼56%) without deteriorating the beam optics, which is designed to deliver a 2 MW injection power of deuterium beams at 100 keV. The plasma generator of the ion source is of a horizontally cusped bucket type, and the whole inner wall, except the cathode filaments and plasma grid side, functions as an anode. The accelerator assembly consists of four multi-circular aperture grids made of copper and four electrode flanges made of aluminum alloy. The electrodes are insulated using PEEK. The ion source will be completed and tested in 2011.

  13. Surface wet-ability modification of thin PECVD silicon nitride layers by 40 keV argon ion treatments

    NASA Astrophysics Data System (ADS)

    Caridi, F.; Picciotto, A.; Vanzetti, L.; Iacob, E.; Scolaro, C.

    2015-10-01

    Measurements of wet-ability of liquid drops have been performed on a 30 nm silicon nitride (Si3N4) film deposited by a PECVD reactor on a silicon wafer and implanted by 40 keV argon ions at different doses. Surface treatments by using Ar ion beams have been employed to modify the wet-ability. The chemical composition of the first Si3N4 monolayer was investigated by means of X-ray Photoelectron Spectroscopy (XPS). The surface morphology was tested by Atomic Force Microscopy (AFM). Results put in evidence the best implantation conditions for silicon nitride to increase or to reduce the wet-ability of the biological liquid. This permits to improve the biocompatibility and functionality of Si3N4. In particular experimental results show that argon ion bombardment increases the contact angle, enhances the oxygen content and increases the surface roughness.

  14. EDITORIAL: Negative ion based neutral beam injection

    NASA Astrophysics Data System (ADS)

    Hemsworth, R. S.

    2006-06-01

    It is widely recognized that neutral beam injection (NBI), i.e. the injection of high energy, high power, beams of H or D atoms, is a flexible and reliable system that has been the main heating system on a large variety of fusion devices, and NBI has been chosen as one of the three heating schemes of the International Tokomak Reactor (ITER). To date, all the NBI systems but two have been based on the neutralization (in a simple gas target) of positive hydrogen or deuterium ions accelerated to <100 keV/nucleon. Above that energy the neutralization of positive ions falls to unacceptably low values, and higher energy neutral beams have to be created by the neutralization of accelerated negative ions (in a simple gas target), as this remains high (approx60%) up to >1 MeV/nucleon. Unfortunately H- and D- are difficult to create, and the very characteristic that makes them attractive, the ease with which the electron is detached from the ion, means that it is difficult to create high concentrations or fluxes of them, and it is difficult to avoid substantial, collisional, losses in the extraction and acceleration processes. However, there has been impressive progress in negative ion sources and accelerators over the past decade, as demonstrated by the two pioneering, operational, multi-megawatt, negative ion based, NBI systems at LHD (180 keV, H0) and JT-60U (500 keV, D0), both in Japan. Nevertheless, the system proposed for ITER represents a substantial technological challenge as an increase is required in beam energy, to 1 MeV, D0, accelerated ion (D-) current, to 40 A, accelerated current density, 200 A m-2 of D-, and pulse length, to 1 h. At the Fourth IAEA Technical Meeting on Negative Ion Based Neutral Beam Injectors, hosted by the Consorzio RFX, Padova, Italy, 9-11 May 2005, the status of the R&D aimed at the realization of the injectors for ITER was presented. Because of the importance of this development to the success of the ITER project, participants at that

  15. Solar wind ions accelerated to 40 keV by shock wave disturbances

    NASA Astrophysics Data System (ADS)

    Gosling, J. T.; Asbridge, J. R.; Bame, S. J.; Feldman, W. C.; Paschmann, G.; Sckopke, N.

    1980-02-01

    Observations in the solar wind with the LASL/MPI fast plasma experiment on ISEE 1 and 2 reveal the common presence of ions with energies extending from 100 eV up to at least 40 keV in a broad region, typically 10 million kilometers wide, following interplanetary shocks. Peak differential fluxes up to 5000/sq cm s sr keV at 28 keV are observed either at the shock or within the first 1.5 hours following shock passage. In the solar wind frame the distribution function of these ions is roughly isotropic, peaks near zero velocity, and above 5 keV can adequately be characterized as power law in energy with a spectral index of 2.7. The effective 'temperature' of these ions generally exceeds 100 million K. These suprathermal interplanetary ions are almost certainly solar wind ions which have been accelerated by some mechanism associated with the shock wave disturbance. Present evidence leads the authors to favor stochastic particle acceleration involving electrostatic and/or electromagnetic turbulence in the postshock flow.

  16. Study of local in-homogeneity in ion beam mixing using SIMS ion imaging techniques

    SciTech Connect

    Singh, Ch. Kishan; Ilango, S.; Dash, S.; Tyagi, A. K.

    2012-06-05

    The local in-homogeneity in ion beam mixing of Mo/Si system subjected to 110keV Ar{sup +} ion implantation is studied using secondary ion imaging. Sequences of images are recorded across the interface and depth profiles are constructed from different regions of the image planes. Our results show a significant variation in decay length indicative of in-homogeneity in mixing.

  17. Studies of Ion Beam Charge Neutralization by Ferroelectric Plasma Sources

    NASA Astrophysics Data System (ADS)

    Stepanov, A.; Gilson, E. P.; Grisham, L.; Davidson, R. C.

    2013-10-01

    Space-charge forces limit the possible transverse compression of high perveance ion beams that are used in ion-beam-driven high energy density physics applications; the minimum radius to which a beam can be focused is an increasing function of perveance. The limit can be overcome if a plasma is introduced in the beam path between the focusing element and the target in order to neutralize the space charge of the beam. This concept has been implemented on the Neutralized Drift Compression eXperiment (NDCX) at LBNL using Ferroelectric Plasma Sources (FEPS). In our experiment at PPPL, we propagate a perveance-dominated ion beam through a FEPS to study the effect of the neutralizing plasma on the beam envelope and its evolution in time. A 30-60 keV space-charge-dominated Argon beam is focused with an Einzel lens into a FEPS located at the beam waist. The beam is intercepted downstream from the FEPS by a movable Faraday cup that provides time-resolved 2D current density profiles of the beam spot on target. We report results on: (a) dependence of charge neutralization on FEPS plasma density; (b) effects on beam emittance, and (c) time evolution of the beam envelope after the FEPS pulse. Research supported by the U.S. Department of Energy.

  18. Cold atomic beam ion source for focused ion beam applications

    NASA Astrophysics Data System (ADS)

    Knuffman, B.; Steele, A. V.; McClelland, J. J.

    2013-07-01

    We report measurements and modeling of an ion source that is based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam systems. Our measurements of total ion current as a function of ionization conditions support an analytical model that also predicts the cross-sectional current density and spatial distribution of ions created in the source. The model predicts a peak brightness of 2 × 107 A m-2 sr-1 eV-1 and an energy spread less than 0.34 eV. The model is also combined with Monte-Carlo simulations of the inter-ion Coulomb forces to show that the source can be operated at several picoamperes with a brightness above 1 × 107 A m-2 sr-1 eV-1. We estimate that when combined with a conventional ion focusing column, an ion source with these properties could focus a 1 pA beam into a spot smaller than 1 nm. A total current greater than 5 nA was measured in a lower-brightness configuration of the ion source, demonstrating the possibility of a high current mode of operation.

  19. Cold atomic beam ion source for focused ion beam applications

    SciTech Connect

    Knuffman, B.; Steele, A. V.; McClelland, J. J.

    2013-07-28

    We report measurements and modeling of an ion source that is based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam systems. Our measurements of total ion current as a function of ionization conditions support an analytical model that also predicts the cross-sectional current density and spatial distribution of ions created in the source. The model predicts a peak brightness of 2 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1} and an energy spread less than 0.34 eV. The model is also combined with Monte-Carlo simulations of the inter-ion Coulomb forces to show that the source can be operated at several picoamperes with a brightness above 1 × 10{sup 7} A m{sup −2} sr{sup −1} eV{sup −1}. We estimate that when combined with a conventional ion focusing column, an ion source with these properties could focus a 1 pA beam into a spot smaller than 1 nm. A total current greater than 5 nA was measured in a lower-brightness configuration of the ion source, demonstrating the possibility of a high current mode of operation.

  20. Development of a collimated keV X-ray beam for probing of dense plasmas

    NASA Astrophysics Data System (ADS)

    Shah, R.; Taphuoc, K.; Albert, F.; Rousse, A.; Burgy, F.; Mercier, B.; Rousseau, J.-P.; Pukhov, A.; Kiselev, S.

    2006-06-01

    Experimental findings of a fully optical, keV x-ray source of 1-2circ divergence and broadband spectrum (>5 keV bandwidth) are presented. The radiation results from the highly relativistic interaction of a 30 TW(1 J, 30 fs) laser pulse thru a 3 mm length span of He gas (ne=1× 1019 electrons/cm3). Quantitative measurements from the filtered back-illuminated CCD give 105 photons/eV, and the knife-edge technique measures the source diameter of 10 μm. These source characteristics, the measured beam of relativistic electrons, and PIC simulation indicate the radiation results from forceful transverse oscillations of the laser-accelerated electrons in response to the ionic channel formed by the laser pulse. The source brightness (107 photons/eV/mm2/mr2/shot and ultrafast duration (≤30 fs) make it applicable to both backlighting and x-ray science applications.

  1. Simultaneous ejection of two molecular ions from keV gold atomic and polyatomic projectile impacts.

    PubMed

    Rickman, R D; Verkhoturov, S V; Parilis, E S; Schweikert, E A

    2004-01-30

    We present the first experimental data on the simultaneous ejection of two molecular ions from the impact of Au(+)(n) (1< or =n< or =4) with energies ranging between 17 and 56 keV. The yields from single phenylalanine (Ph) emission, coemission of two Ph ions, and emission of the Ph dimer were measured. Large increases (1 to 2 orders of magnitude) in coemitted ion yields were observed with increasing projectile energy and complexity. Correlation coefficients were calculated for the coemission of two Ph ions; their behavior suggests differences in emission pathways for bombardment by atomic and polyatomic projectiles.

  2. Fast Ion Beam Microscopy of Whole Cells

    NASA Astrophysics Data System (ADS)

    Watt, Frank; Chen, Xiao; Chen, Ce-Belle; Udalagama, Chammika Nb; Ren, Minqin; Pastorin, G.; Bettiol, Andrew

    2013-08-01

    The way in which biological cells function is of prime importance, and the determination of such knowledge is highly dependent on probes that can extract information from within the cell. Probing deep inside the cell at high resolutions however is not easy: optical microscopy is limited by fundamental diffraction limits, electron microscopy is not able to maintain spatial resolutions inside a whole cell without slicing the cell into thin sections, and many other new and novel high resolution techniques such as atomic force microscopy (AFM) and near field scanning optical microscopy (NSOM) are essentially surface probes. In this paper we show that microscopy using fast ions has the potential to extract information from inside whole cells in a unique way. This novel fast ion probe utilises the unique characteristic of MeV ion beams, which is the ability to pass through a whole cell while maintaining high spatial resolutions. This paper first addresses the fundamental difference between several types of charged particle probes, more specifically focused beams of electrons and fast ions, as they penetrate organic material. Simulations show that whereas electrons scatter as they penetrate the sample, ions travel in a straight path and therefore maintain spatial resolutions. Also described is a preliminary experiment in which a whole cell is scanned using a low energy (45 keV) helium ion microscope, and the results compared to images obtained using a focused beam of fast (1.2 MeV) helium ions. The results demonstrate the complementarity between imaging using low energy ions, which essentially produce a high resolution image of the cell surface, and high energy ions, which produce an image of the cell interior. The characteristics of the fast ion probe appear to be ideally suited for imaging gold nanoparticles in whole cells. Using scanning transmission ion microscopy (STIM) to image the cell interior, forward scattering transmission ion microscopy (FSTIM) to improve the

  3. High-brightness Cs focused ion beam from a cold-atomic-beam ion source

    NASA Astrophysics Data System (ADS)

    Steele, A. V.; Schwarzkopf, A.; McClelland, J. J.; Knuffman, B.

    2017-06-01

    We present measurements of focal spot size and brightness in a focused ion beam system utilizing a laser-cooled atomic beam source of Cs ions. Spot sizes as small as (2.1 ± 0.2) nm (one standard deviation) and reduced brightness values as high as (2.4 ± 0.1) × 107 A m-2 Sr-1 eV-1 are observed with a 10 keV beam. This measured brightness is over 24 times higher than the highest brightness observed in a Ga liquid metal ion source. The behavior of brightness as a function of beam current and the dependence of effective source temperature on ionization energy are examined. The performance is seen to be consistent with earlier predictions. Demonstration of this source with very high brightness, producing a heavy ionic species such as Cs+, promises to allow significant improvements in resolution and throughput for such applications as next-generation circuit edit and nanoscale secondary ion mass spectrometry.

  4. Focused Ion Beam Induced Effects on MOS Transistor Parameters

    SciTech Connect

    Abramo, Marsha T.; Antoniou, Nicholas; Campbell, Ann N.; Fleetwood, Daniel M.; Hembree, Charles E.; Jessing, Jeffrey R.; Soden, Jerry M.; Swanson, Scot E.; Tangyunyong, Paiboon; Vanderlinde, William E.

    1999-07-28

    We report on recent studies of the effects of 50 keV focused ion beam (FIB) exposure on MOS transistors. We demonstrate that the changes in value of transistor parameters (such as threshold voltage, V{sub t}) are essentially the same for exposure to a Ga+ ion beam at 30 and 50 keV under the same exposure conditions. We characterize the effects of FIB exposure on test transistors fabricated in both 0.5 {micro}m and 0.225 {micro}m technologies from two different vendors. We report on the effectiveness of overlying metal layers in screening MOS transistors from FIB-induced damage and examine the importance of ion dose rate and the physical dimensions of the exposed area.

  5. Neutral-beam system based on BNL negative-hydrogen-ion sources

    SciTech Connect

    Prelec, K.

    1982-01-01

    Parameters of the conceptual design of the BNL neutral beam system were determined as follows: beam energy, 200 keV; negative ion current, 10A; neutral beam power, 1 MW; pulse length, multisecond to steady state. The completed system study, supported by successful ion source operation at the required level, will serve to evaluate and compare different approaches in the design of a negative ion based system and, eventually, lead to the design and construction of an operational system.

  6. Ions Beams and Ferroelectric Plasma Sources

    SciTech Connect

    Stepanov, Anton

    2014-09-01

    Near-perfect space-charge neutralization is required for the transverse compression of high perveance ion beams for ion-beam-driven warm dense matter experiments, such as the Neutralized Drift Compression eXperiment (NDCX). Neutralization can be accomplished by introducing a plasma in the beam path, which provides free electrons that compensate the positive space charge of the ion beam. In this thesis, charge neutralization of a 40~keV, perveance-dominated Ar$^+$ beam by a Ferroelectric Plasma Source (FEPS) is investigated. First, the parameters of the ion beam, such as divergence due to the extraction optics, charge neutralization fraction, and emittance were measured. The ion beam was propagated through the FEPS plasma, and the effects of charge neutralization were inferred from time-resolved measurements of the transverse beam profile. In addition, the dependence of FEPS plasma parameters on the configuration of the driving pulser circuit was studied to optimize pulser design. An ion accelerator was constructed that produced a 30-50~keV Ar$^+$ beam with pulse duration $<$300~$\\mu$s and dimensionless perveance $Q$ up to 8$\\times$10$^{-4}$. Transverse profile measurements 33~cm downstream of the ion source showed that the dependence of beam radius on $Q$ was consistent with space charge expansion. It was concluded that the beam was perveance-dominated with a charge neutralization fraction of approximately zero in the absence of neutralizing plasma. Since beam expansion occurred primarily due to space charge, the decrease in effective perveance due to neutralization by FEPS plasma can be inferred from the reduction in beam radius. Results on propagation of the ion beam through FEPS plasma demonstrate that after the FEPS is triggered, the beam radius decreases to its neutralized value in about 5~$\\mu$s. The duration of neutralization was about 10~$\\mu$s at a charging voltage $V_{FEPS}$~=~5.5~kV and 35~$\\mu$s at $V_{FEPS}$~=~6.5~kV. With $V_{FEPS}$~=~6.5~kV, the

  7. Magnetic field design for a Penning ion source for a 200 keV electrostatic accelerator

    NASA Astrophysics Data System (ADS)

    Fathi, A.; Feghhi, S. A. H.; Sadati, S. M.; Ebrahimibasabi, E.

    2017-04-01

    In this study, the structure of magnetic field for a Penning ion source has been designed and constructed with the use of permanent magnets. The ion source has been designed and constructed for a 200 keV electrostatic accelerator. With using CST Studio Suite, the magnetic field profile inside the ion source was simulated and an appropriate magnetic system was designed to improve particle confinement. Designed system consists of two ring magnets with 9 mm distance from each other around the anode. The ion source was constructed and the cylindrical magnet and designed magnetic system were tested on the ion source. The results showed that the ignition voltage for ion source with the designed magnetic system is almost 300 V lower than the ion source with the cylindrical magnet. Better particle confinement causes lower voltage discharge to occur.

  8. Inelastic electronic excitation and electron transfer processes in collisions between Mg(3 {sup 1}S{sub 0}) atoms and K{sup +}({sup 1}S{sub 0}) ions studied by crossed beams in the 0.10-3.80-keV energy range

    SciTech Connect

    Sabido, M.; Andres, J. de; Sogas, J.; Lucas, J.M.; Alberti, M.; Bofill, J.M.; Aguilar, A.

    2005-09-22

    Inelastic and charge-transfer excitation processes in collisions between ground-state neutral Mg atoms and K{sup +} ions have been studied by means of a crossed molecular-beam technique. Decay fluorescent emissions from Mg(3 {sup 1}P{sub 1}),Mg(4 {sup 3}S{sub 1}), and Mg(3s{sup 1}3d{sup 1},3 {sup 3}D{sub 3,2,1}) as well as the phosphorescent emission due to Mg(3 {sup 3}P{sub 1}) have been observed from excited Mg atoms and the charge-transfer emission decays from K(4 {sup 2}P{sub 3/2,1/2}),K(5 {sup 2}P{sub 3/2,1/2}),K(6 {sup 2}S{sub 1/2}), and K(4 {sup 2}D{sub 5/2,3/2}) for excited K atoms. The corresponding absolute cross-sections values versus collision energy functions were determined in the 0.10-3.80 keV laboratory energy range. In order to interpret the experimental results, accurate ab initio full configuration-interaction calculations using pseudopotentials have been performed for the (Mg-K){sup +} system, giving a manifold of adiabatic singlet and triplet potential-energy curves correlating with the different collision channels, which allow a qualitative interpretation of the emission excitation functions measured for the different processes studied. A comparative study with other Mg-alkali ion systems previously studied is also included.

  9. Steady State Sputtering Yields and Surface Compositions of Depleted Uranium and Uranium Carbide bombarded by 30 keV Gallium or 16 keV Cesium Ions.

    SciTech Connect

    Siekhaus, W. J.; Teslich, N. E.; Weber, P. K.

    2014-10-23

    Depleted uranium that included carbide inclusions was sputtered with 30-keV gallium ions or 16-kev cesium ions to depths much greater than the ions’ range, i.e. using steady-state sputtering. The recession of both the uranium’s and uranium carbide’s surfaces and the ion corresponding fluences were used to determine the steady-state target sputtering yields of both uranium and uranium carbide, i.e. 6.3 atoms of uranium and 2.4 units of uranium carbide eroded per gallium ion, and 9.9 uranium atoms and 3.65 units of uranium carbide eroded by cesium ions. The steady state surface composition resulting from the simultaneous gallium or cesium implantation and sputter-erosion of uranium and uranium carbide were calculated to be U₈₆Ga₁₄, (UC)₇₀Ga₃₀ and U₈₁Cs₉, (UC)₇₉Cs₂₁, respectively.

  10. Tuning of wettability of PANI-GNP composites using keV energy ions

    NASA Astrophysics Data System (ADS)

    Lakshmi, G. B. V. S.; Avasthi, D. K.

    2016-07-01

    Polyaniline nanofiber composites with various nanomaterials have several applications in electrochemical biosensors. The surface properties of these composites coated electrodes play crucial role in enzyme absorption and analyte detection process. In the present study, Polyaniline-Graphene nanopowder (PANI-GNP) composites were prepared by rapid-mixing polymerization method. The films were prepared on ITO coated glass substrates and irradiated with 42 keV He+ ions produced by indigenously fabricated accelerator at IUAC, New Delhi. The films were characterized before and after irradiation by SEM, Raman spectroscopy and contact angle measurements. The as-prepared films show superhydrophilic nature and after irradiation the films show highly hydrophobic nature with water contact angle (135°). The surface morphology was studied by SEM and structural changes were studied by Raman spectra. The surface morphological modifications induced by keV energy ions helps in tuning the wettability at different ion fluences.

  11. Ion Beam Processing.

    DTIC Science & Technology

    1987-03-13

    ure are only those which had the greatest effect . Several features of this periodic chart are worth not- ing: i) some elements improve more than one...from nearly all the groups of the periodic table can have beneficial effects on a given property. iv) Ions which improve properties are highlighted...here, but ions which have deleterious effects may also be implanted which facilitates the study of mechanisms of wear and corrosion. v) Elements to

  12. Optimization of the cell in the ion-optical system of a powerful source of protons with energy 15 keV

    NASA Astrophysics Data System (ADS)

    Sorokin, A. V.; Davydenko, V. I.; Deichuli, P. P.; Ivanov, A. A.

    2016-07-01

    We have described the results of numerical investigations of different versions of a three-electrode elementary slit cell for the formation a hydrogen ion beam with a relatively low energy and a high emission current density. The version of the cell chosen from the results of these investigations makes it possible to obtain a hydrogen atom beam with an energy of 15 keV, an ion current density of ~500 mA/cm2, and an angular divergence of 24 mrad.

  13. Evidence that Clouds of keV Hydrogen Ion Clusters Bounce Elastically from a Solid Surface

    NASA Technical Reports Server (NTRS)

    Lewis, R. A.; Martin, James J.; Chakrabarti, Suman; Rodgers, Stephen L. (Technical Monitor)

    2002-01-01

    The behavior of hydrogen ion clusters is tested by an inject/hold/extract technique in a Penning-Malmberg trap. The timing pattern of the extraction signals is consistent with the clusters bouncing elastically from a detector several times. The ion clusters behave more like an elastic fluid than a beam of ions.

  14. Multi-slit triode ion optical system with ballistic beam focusing

    SciTech Connect

    Davydenko, V. Amirov, V.; Gorbovsky, A.; Deichuli, P.; Ivanov, A.; Kolmogorov, A.; Kapitonov, V.; Mishagin, V.; Shikhovtsev, I.; Sorokin, A.; Stupishin, N.; Karpushov, A. N.; Smirnov, A.; Uhlemann, R.

    2016-02-15

    Multi-slit triode ion-optical systems with spherical electrodes are of interest for formation of intense focused neutral beams for plasma heating. At present, two versions of focusing multi-slit triode ion optical system are developed. The first ion optical system forms the proton beam with 15 keV energy, 140 A current, and 30 ms duration. The second ion optical system is intended for heating neutral beam injector of Tokamak Configuration Variable (TCV). The injector produces focused deuterium neutral beam with 35 keV energy, 1 MW power, and 2 s duration. In the later case, the angular beam divergence of the neutral beam is 20-22 mrad in the direction across the slits of the ion optical system and 12 mrad in the direction along the slits.

  15. Photon, Electron and Secondary Ion Emission from Single C60 keV Impacts

    PubMed Central

    Fernandez-Lima, F. A.; Eller, M. J.; Verkhoturov, S. V.; Della-Negra, S.; Schweikert, E. A.

    2010-01-01

    This paper presents the first observation of coincidental emission of photons, electrons and secondary ions from individual C60 keV impacts. An increase in photon, electron and secondary ion yields is observed as a function of C60 projectile energy. The effect of target structure/composition on photon and electron emissions at the nanometer level is shown for a CsI target. The time-resolved photon emission may be characterized by a fast component emission in the UV-Vis range with a short decay time, while the electron and secondary ion emission follow a Poisson distribution. PMID:21218166

  16. Linac4 low energy beam measurements with negative hydrogen ions

    NASA Astrophysics Data System (ADS)

    Scrivens, R.; Bellodi, G.; Crettiez, O.; Dimov, V.; Gerard, D.; Granemann Souza, E.; Guida, R.; Hansen, J.; Lallement, J.-B.; Lettry, J.; Lombardi, A.; Midttun, Ø.; Pasquino, C.; Raich, U.; Riffaud, B.; Roncarolo, F.; Valerio-Lizarraga, C. A.; Wallner, J.; Yarmohammadi Satri, M.; Zickler, T.

    2014-02-01

    Linac4, a 160 MeV normal-conducting H- linear accelerator, is the first step in the upgrade of the beam intensity available from the LHC proton injectors at CERN. The Linac4 Low Energy Beam Transport (LEBT) line from the pulsed 2 MHz RF driven ion source, to the 352 MHz RFQ (Radiofrequency Quadrupole) has been built and installed at a test stand, and has been used to transport and match to the RFQ a pulsed 14 mA H- beam at 45 keV. A temporary slit-and-grid emittance measurement system has been put in place to characterize the beam delivered to the RFQ. In this paper a description of the LEBT and its beam diagnostics is given, and the results of beam emittance measurements and beam transmission measurements through the RFQ are compared with the expectation from simulations.

  17. Linac4 low energy beam measurements with negative hydrogen ions

    SciTech Connect

    Scrivens, R. Bellodi, G.; Crettiez, O.; Dimov, V.; Gerard, D.; Granemann Souza, E.; Guida, R.; Hansen, J.; Lallement, J.-B.; Lettry, J.; Lombardi, A.; Midttun, Ø.; Pasquino, C.; Raich, U.; Riffaud, B.; Roncarolo, F.; Valerio-Lizarraga, C. A.; Wallner, J.; Yarmohammadi Satri, M.; Zickler, T.

    2014-02-15

    Linac4, a 160 MeV normal-conducting H{sup −} linear accelerator, is the first step in the upgrade of the beam intensity available from the LHC proton injectors at CERN. The Linac4 Low Energy Beam Transport (LEBT) line from the pulsed 2 MHz RF driven ion source, to the 352 MHz RFQ (Radiofrequency Quadrupole) has been built and installed at a test stand, and has been used to transport and match to the RFQ a pulsed 14 mA H{sup −} beam at 45 keV. A temporary slit-and-grid emittance measurement system has been put in place to characterize the beam delivered to the RFQ. In this paper a description of the LEBT and its beam diagnostics is given, and the results of beam emittance measurements and beam transmission measurements through the RFQ are compared with the expectation from simulations.

  18. Adhesive bonding of ion beam textured metals and fluoropolymers

    NASA Technical Reports Server (NTRS)

    Mirtich, M. J.; Sovey, J. S.

    1978-01-01

    An electron bombardment argon ion source was used to ion etch various metals and fluoropolymers. The metal and fluoropolymers were exposed to (0.5 to 1.0) keV Ar ions at ion current densities of (0.2 to 1.5) mA/sq cm for various exposure times. The resulting surface texture is in the form of needles or spires whose vertical dimensions may range from tenths to hundreds of micrometers, depending on the selection of beam energy, ion current density, and etch time. The bonding of textured surfaces is accomplished by ion beam texturing mating pieces of either metals or fluoropolymers and applying a bonding agent which wets in and around the microscopic cone-like structures. After bonding, both tensile and shear strength measurements were made on the samples. Also tested, for comparison's sake, were untextured and chemically etched fluoropolymers. The results of these measurements are presented.

  19. Experimental optimization of beam quality extracted from a duoplasmatron proton ion source

    SciTech Connect

    Batygin, Y. K.; Draganic, I. N.; Fortgang, C. M.

    2014-10-01

    The LANSCE accelerator facility operates with two independent ion injectors for H⁺ and H⁻ particle beams. The H⁺ ion beam is formed using a duoplasmatron source followed by a 750 keV Cockroft-Walton accelerating column. Formation of an optimal plasma meniscus is an important feature for minimizing beam emittance, and maximizing beam brightness. A series of experiments were performed to find the optimal combination of extraction voltage and extracted current for the H⁺ beam. Measurements yielded the best ratio of beam perveance to Child–Langmuir perveance of 0.52 for maximizing beam brightness.

  20. Upgrade of the electron beam ion trap in Shanghai.

    PubMed

    Lu, D; Yang, Y; Xiao, J; Shen, Y; Fu, Y; Wei, B; Yao, K; Hutton, R; Zou, Y

    2014-09-01

    Over the last few years the Shanghai electron beam ion trap (EBIT) has been successfully redesigned and rebuilt. The original machine, developed under collaboration with the Shanghai Institute of Applied Physics, first produced an electron beam in 2005. It could be tuned with electron energies between 1 and 130 keV and beam current up to 160 mA. After several years of operation, it was found that several modifications for improvements were necessary to reach the goals of better electron optics, higher photon detection, and ion injection efficiencies, and more economical running costs. The upgraded Shanghai-EBIT is made almost entirely from Ti instead of stainless steel and achieves a vacuum of less than 10(-10) Torr, which helps to minimize the loss of highly changed ions through charge exchange. Meanwhile, a more compact structure and efficient cryogenic system, and excellent optical alignment have been of satisfactory. The magnetic field in the central trap region can reach up till 4.8 T with a uniformity of 2.77 × 10(-4). So far the upgraded Shanghai-EBIT has been operated up to an electron energy of 151 keV and a beam current of up to 218 mA, although promotion to even higher energy is still in progress. Radiation from ions as highly charged as Xe(53+, 54+) has been produced and the characterization of current density is estimated from the measured electron beam width.

  1. Upgrade of the electron beam ion trap in Shanghai

    SciTech Connect

    Lu, D.; Yang, Y.; Xiao, J.; Shen, Y.; Fu, Y.; Wei, B.; Yao, K.; Hutton, R.; Zou, Y.

    2014-09-15

    Over the last few years the Shanghai electron beam ion trap (EBIT) has been successfully redesigned and rebuilt. The original machine, developed under collaboration with the Shanghai Institute of Applied Physics, first produced an electron beam in 2005. It could be tuned with electron energies between 1 and 130 keV and beam current up to 160 mA. After several years of operation, it was found that several modifications for improvements were necessary to reach the goals of better electron optics, higher photon detection, and ion injection efficiencies, and more economical running costs. The upgraded Shanghai-EBIT is made almost entirely from Ti instead of stainless steel and achieves a vacuum of less than 10{sup −10} Torr, which helps to minimize the loss of highly changed ions through charge exchange. Meanwhile, a more compact structure and efficient cryogenic system, and excellent optical alignment have been of satisfactory. The magnetic field in the central trap region can reach up till 4.8 T with a uniformity of 2.77 × 10{sup −4}. So far the upgraded Shanghai-EBIT has been operated up to an electron energy of 151 keV and a beam current of up to 218 mA, although promotion to even higher energy is still in progress. Radiation from ions as highly charged as Xe{sup 53+,} {sup 54+} has been produced and the characterization of current density is estimated from the measured electron beam width.

  2. Upgrade of the electron beam ion trap in Shanghai

    NASA Astrophysics Data System (ADS)

    Lu, D.; Yang, Y.; Xiao, J.; Shen, Y.; Fu, Y.; Wei, B.; Yao, K.; Hutton, R.; Zou, Y.

    2014-09-01

    Over the last few years the Shanghai electron beam ion trap (EBIT) has been successfully redesigned and rebuilt. The original machine, developed under collaboration with the Shanghai Institute of Applied Physics, first produced an electron beam in 2005. It could be tuned with electron energies between 1 and 130 keV and beam current up to 160 mA. After several years of operation, it was found that several modifications for improvements were necessary to reach the goals of better electron optics, higher photon detection, and ion injection efficiencies, and more economical running costs. The upgraded Shanghai-EBIT is made almost entirely from Ti instead of stainless steel and achieves a vacuum of less than 10-10 Torr, which helps to minimize the loss of highly changed ions through charge exchange. Meanwhile, a more compact structure and efficient cryogenic system, and excellent optical alignment have been of satisfactory. The magnetic field in the central trap region can reach up till 4.8 T with a uniformity of 2.77 × 10-4. So far the upgraded Shanghai-EBIT has been operated up to an electron energy of 151 keV and a beam current of up to 218 mA, although promotion to even higher energy is still in progress. Radiation from ions as highly charged as Xe53+, 54+ has been produced and the characterization of current density is estimated from the measured electron beam width.

  3. Development of polyatomic ion beam system using liquid organic materials

    NASA Astrophysics Data System (ADS)

    Takaoka, G. H.; Nishida, Y.; Yamamoto, T.; Kawashita, M.

    2005-08-01

    We have developed a new type of polyatomic ion beam system using liquid organic materials such as octane and ethanol, which consists of a capillary type of nozzle, an ionizer, a mass-separator and a substrate holder. Ion current extracted after ionization was 430 μA for octane and 200 μA for ethanol, respectively. The mass-analysis was realized using a compact E × B mass filter, and the mass-analyzed ion beams were transferred toward the substrate. The ion current density at the substrate was a few μA/cm2 for the mass-separated ion species. Interactions of polyatomic ion beams with silicon (Si) surfaces were investigated by utilizing the ellipsometry measurement. It was found that the damaged layer thickness irradiated by the polyatomic ions with a mass number of about 40 was smaller than that by Ar ion irradiation at the same incident energy and ion fluence. The result indicated that the rupture of polyatomic ions occurred upon its impact on the Si surface with an incident energy larger than a few keV. In addition, the chemical modification of Si surfaces such as wettability could be achieved by adjusting the incident energy for the ethanol ions, which included all the fragment ions.

  4. Ion Beam Therapy in Europe

    NASA Astrophysics Data System (ADS)

    Kraft, Gerhard

    2009-03-01

    At present, seven facilities in Europe treat deep-seated tumors with particle beams, six with proton beams and one with carbon ions. Three of these facilities are in Moscow, St. Petersburg and Dubna, Russia. Other facilities include the TSL Uppsala, Sweden, CPO Orsay, France, and PSI Villigen, Switzerland, all for proton therapy, and GSI, Darmstadt, Germany, which utilizes carbon ions only. But only two of these facilities irradiate with scanned ion beams: the Paul Scherer Institute (PSI), Villigen (protons) and the Gesellschaft für Schwerionenforschung (GSI), Darmstadt. These two facilities are experimental units within physics laboratories and have developed the technique of intensity-modulated beam scanning in order to produce irradiation conforming to a 3-D target. There are three proton centers presently under construction in Munich, Essen and Orsay, and the proton facility at PSI has added a superconducting accelerator connected to an isocentric gantry in order to become independent of the accelerator shared with the physics research program. The excellent clinical results using carbon ions at National Institute of Radiological Science (NIRS) in Chiba and GSI have triggered the construction of four new heavy-ion therapy projects (carbon ions and protons), located in Heidelberg, Pavia, Marburg and Kiel. The projects in Heidelberg and Pavia will begin patient treatment in 2009, and the Marburg and Kiel projects will begin in 2010 and 2011, respectively. These centers use different accelerator designs but have the same kind of treatment planning system and use the same approach for the calculation of the biological effectiveness of the carbon ions as developed at GSI [1]. There are many other planned projects in the works. Do not replace the word "abstract," but do replace the rest of this text. If you must insert a hard line break, please use Shift+Enter rather than just tapping your "Enter" key. You may want to print this page and refer to it as a style

  5. Microstructural investigation of alumina implanted with 30 keV nitrogen ions

    NASA Astrophysics Data System (ADS)

    Shikha, Deep; Jha, Usha; Sinha, S. K.; Barhai, P. K.; Sarkhel, G.; Nair, K. G. M.; Dash, S.; Tyagi, A. K.; Kothari, D. C.

    2007-11-01

    Among ceramics, alumina is being widely used as biomaterials now these days. It is being used as hip joints, tooth roots etc. Ion implantation has been employed to modify its surface without changing it bulk properties. 30 keV nitrogen with varying ion dose ranging from 5 × 10 15 ions/cm 2 to 5 × 10 17 ions/cm 2 is implanted in alumina. Surface morphology has been studied with optical microscope and atomic force microscope (AFM). Improvement in brittleness has been observed with the increase in ion dose. Compound formation and changes in grain size have been studied using X-Ray diffraction (XRD). AlN compound formation is also observed by Fourier transform infrared spectroscopy (FTIR). The change in the grain size is related with the nanohardness and Hall-Petch relationship is verified.

  6. Irradiation effects on secondary structure of protein induced by keV ions

    NASA Astrophysics Data System (ADS)

    Cui, F. Z.; Lin, Y. B.; Zhang, D. M.; Tian, M. B.

    2001-01-01

    Protein secondary structure changes by low-energy ion irradiation are reported for the first time. The selected system is 30 keV N + irradiation on bovine serum albumin (BSA). After irradiation at increasing fluences from 1.0×10 15 to 2.5×10 16 ion/cm 2, Fourier transform infrared spectra analysis was conducted. It was found that the secondary structures of BSA molecules were very sensitive to ion irradiation. Secondary conformations showed different trends of change during irradiation. With the increase of ion fluence from 0 to 2.5×10 16 ion/cm 2, the fraction of α-helix and β-turns decreased from 17 to 12%, and from 40 to 31%, respectively, while that of random coil and β-sheet structure increased from 18 to 27%, and from 25 to 30%, respectively. Possible explanations for the secondary conformational changes of protein are proposed.

  7. Materials processing with intense pulsed ion beams

    SciTech Connect

    Rej, D.J.; Davis, H.A.; Olson, J.C.

    1996-12-31

    We review research investigating the application of intense pulsed ion beams (IPIBs) for the surface treatment and coating of materials. The short range (0.1-10 {mu}m) and high-energy density (1-50 J/cm{sup 2}) of these short-pulsed ({le} 1 {mu}s) beams (with ion currents I = 5 - 50 kA, and energies E = 100 - 1000 keV) make them ideal to flash-heat a target surface, similar to the more familiar pulsed laser processes. IPIB surface treatment induces rapid melt and solidification at up to 10{sup 10} K/s to cause amorphous layer formation and the production of non-equilibrium microstructures. At higher energy density the target surface is vaporized, and the ablated vapor is condensed as coatings onto adjacent substrates or as nanophase powders. Progress towards the development of robust, high-repetition rate IPIB accelerators is presented along with economic estimates for the cost of ownership of this technology.

  8. Areal density effects on the blocking of 3-keV Ne7+ ions guided through nanocapillaries in polymers

    NASA Astrophysics Data System (ADS)

    Stolterfoht, N.; Hellhammer, R.; Sulik, B.; Juhász, Z.; Bayer, V.; Trautmann, C.; Bodewits, E.; Reitsma, G.; Hoekstra, R.

    2013-09-01

    We studied blocking effects on ion guiding through nanocapillaries in highly insulating polyethylene terephthalate (PET). The experiments were initiated in view of a previous study with capillaries in polycarbonate (PC) for which strong blocking effects were observed, whereas for PET these effects could not be detected. The aim was to find out whether the different results are caused by differences in the PET and PC materials or by differences in the areal densities of the capillaries. Transmission experiments of 3-keV Ne7+ ions were performed for a variety of PET samples with an areal capillary density ranging from 3 to 60×106 cm-2. The tilt angles were close to zero degree because previous blocking effects were found to be largest at small angles. Our results clearly show that blocking effects also exist for PET and that they are sensitively dependent on the areal capillary density, i.e., the mean capillary distance. The potential produced by the charges accumulated in neighboring capillaries is calculated showing that it plays an important role in the ion blocking. In addition, model calculations are performed providing expressions to determine the direct ion transmission for small tilt angles and divergent ion beams.

  9. Modification of graphene by ion beam

    NASA Astrophysics Data System (ADS)

    Gawlik, G.; Ciepielewski, P.; Jagielski, J.; Baranowski, J.

    2017-09-01

    Ion induced defect generation in graphene was analyzed using Raman spectroscopy. A single layer graphene membrane produced by chemical vapor deposition (CVD) on copper foil and then transferred on glass substrate was subjected to helium, carbon, nitrogen, argon and krypton ions bombardment at energies from the range 25 keV to 100 keV. A density of ion induced defects and theirs mean size were estimated by using Raman measurements. Increasing number of defects generated by ion with increase of ion mass and decrease of ion energy was observed. Dependence of ion defect efficiency (defects/ion) on ion mass end energy was proportional to nuclear stopping power simulated by SRIM. No correlation between ion defect efficiency and electronic stopping power was observed.

  10. Short time ion pulse extraction from the Dresden electron beam ion trapa)

    NASA Astrophysics Data System (ADS)

    Kentsch, U.; Zschornack, G.; Schwan, A.; Ullmann, F.

    2010-02-01

    We present measurements of the extraction of short time pulses of highly charged ions (4 keV, Ar16+) from the Dresden electron beam ion trap. Thereby the dependence of the extractable ionic charge on the extraction regime was investigated. The ion extraction time was varied between 20 ns and 1 μs. Furthermore the production of carbon ions and the influence of the extraction regime on the pulse widths was investigated to obtain information about the suitability of the Dresden EBIS-A in synchrotron based particle therapy facilities.

  11. Production and characterization of ion beams from magnetically insulated diodes

    SciTech Connect

    Neri, J.M.

    1982-01-01

    The operation of magnetically insulated diodes and the characteristics of the resulting ion beams have been investigated using two pulsed power generators, LYNX at the 10/sup 9/W power level, and Neptune at the 10/sup 11/W power level. LYNX is a small magnetically insulated diode driven directly by a Marx bank. By changing the material used as the surface flashover ion source, the majority ion species generated by the diode could be chosen. Ion beams produced so far by this device are: protons, lithium, boron, carbon, sodium, strontium, and barium. Typical beam parameters for the ion beams are peak energies of 300 keV, current densities of 40 to 60 A/cm/sup 2/, and pulse durations of 300 to 400 nsec. The ion beam uniformity, divergence, and reproducibility were shown to be a function of the surface flashover source geometry. Finally, the LYNX ion beam was also used to anneal silicon crystals and other materials science experiments. The diode used on the Neptune generator was designed to study virtual cathode formation in a high power magnetically insulated diode. The physical cathode was replaced by electrons that ExB drift on the applied magnetic field lines. It was found that the best electrode configuration is one in which the electrons are required to only undergo the Hall drift to form the cathode. The divergence of the ion beam was examined with time-dependent and time-integrated shadowbox diagnostics. It was found that the intrinsic divergence of the ion beam does not have a strong directional dependence.

  12. Radiation effects of ion and electron beams on poly(methylphenylsilane)

    NASA Astrophysics Data System (ADS)

    Seki, Shu; Shibata, Hiromi; Ban, Hiroshi; Ishigure, Kenkichi; Tagawa, Seiichi

    1996-11-01

    Radiation effects of ion beams on poly(methylphenylsilane), PMPS are described in the present paper. PMPS solid films irradiated by high energy H +, He +, N + ion beams and electron beams show changes of solubility with a large LET effects. Ion (2 MeV) and electron (20 and 30 keV) beams induce mainly crosslinking of PMPS, while it was reported that UV light and γ-rays caused predominantly main chain scission on PMPS. The G-values of crosslinking increase with the values of LET of incident beams.

  13. ION BEAM FOCUSING MEANS FOR CALUTRON

    DOEpatents

    Backus, J.G.

    1959-06-01

    An ion beam focusing arrangement for calutrons is described. It provides a virtual focus of origin for the ion beam so that the ions may be withdrawn from an arc plasma of considerable width providing greater beam current and accuracy. (T.R.H.)

  14. Ion-beam Plasma Neutralization Interaction Images

    SciTech Connect

    Igor D. Kaganovich; Edward Startsev; S. Klasky; Ronald C. Davidson

    2002-04-09

    Neutralization of the ion beam charge and current is an important scientific issue for many practical applications. The process of ion beam charge and current neutralization is complex because the excitation of nonlinear plasma waves may occur. Computer simulation images of plasma neutralization of the ion beam pulse are presented.

  15. Ion beam guiding with straight and curved Teflon tubes

    NASA Astrophysics Data System (ADS)

    Kojima, Takao M.; Ikeda, Tokihiro; Kanai, Yasuyuki; Yamazaki, Yasunori; Esaulov, Vladimir A.

    2011-09-01

    In an effort to develop a flexible ion beam guiding scheme, the guiding capabilities of straight and curved Teflon tubes were tested with 8 keV Ar8+ ions. The tubes used were about 50 mm long and of 1 mm/2 mm inner and outer diameters. One was straight, and the others were bent with different radii of curvature corresponding to bending angles from 9.6° to 26.7°. Transmission of several tens of per cent of the injected beam was observed for the curved tubes, while transmission through the tilted straight tube vanished when the tilt was more than 7°. This demonstrates the possibility of efficient ion beam guiding with flexible insulator tubes.

  16. Deposition and surface treatment with intense pulsed ion beams

    SciTech Connect

    Olson, J.C.; Davis, H.A.; Rej, D.J.; Waganaar, W.J.; Stinnett, R.W.; McIntyre, D.C.

    1995-02-08

    Intense pulsed ion beams (500 keV, 30 kA, 0.5 {mu}s) are being investigated for materials processing. Demonstrated and potential applications include film deposition, glazing and joining, alloying and mixing, cleaning and polishing, corrosion improvement, polymer surface treatments, and nanophase powder synthesis. Initial experiments at Los Alamos have emphasized thin-film formation by depositing beam ablated target material on substrates. We have deposited films with complex stoichiometry such as YBa{sub 2}Cu{sub 3}O{sub 7-x}, and formed diamond-like-carbon films. Instantaneous deposition rates of 1 mm/sec have been achieved because of the short ion range (typically 1{mu}m), excellent target coupling, and the inherently high energy of these beams. Currently the beams are produced in single shot uncomplicated diodes with good electrical efficiency. High-voltage modulator technology and diodes capable of repetitive firing, needed for commercial application, are being developed.

  17. Radioactive Ion Beams and Radiopharmaceuticals

    NASA Astrophysics Data System (ADS)

    Laxdal, R. E.; Morton, A. C.; Schaffer, P.

    2014-02-01

    Experiments performed at radioactive ion beam facilities shed new light on nuclear physics and nuclear structure, as well as nuclear astrophysics, materials science and medical science. The many existing facilities, as well as the new generation of facilities being built and those proposed for the future, are a testament to the high interest in this rapidly expanding field. The opportunities inherent in radioactive beam facilities have enabled the search for radioisotopes suitable for medical diagnosis or therapy. In this article, an overview of the production techniques and the current status of RIB facilities and proposals will be presented. In addition, accelerator-generated radiopharmaceuticals will be reviewed.

  18. Ion beam deposited protective films

    NASA Technical Reports Server (NTRS)

    Mirtich, M. J.

    1981-01-01

    Single or dual ion beam sources were used to deposit thin films for different applications. Metal and metal oxide films were evaluated as protective coatings for the materials. Film adherence was measured and the most promising films were then tested under environments similar to operating conditions. It was shown that some materials do protect die material (H-13 steel) and do reduce thermal fatigue. Diamondlike films have many useful applications. A series of experiments were conducted to define and optimize new approaches to the manufacture of such films. A dual beam system using argon and methane gases was developed to generate these films.

  19. Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

    SciTech Connect

    Rahinov, Igor; Toker, Yoni; Heber, Oded; Rappaport, Michael; Zajfman, Daniel; Strasser, Daniel; Schwalm, Dirk

    2012-03-15

    A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

  20. Enhancing secondary ion yields in time of flight-secondary ion mass spectrometry using water cluster primary beams.

    PubMed

    Sheraz née Rabbani, Sadia; Barber, Andrew; Fletcher, John S; Lockyer, Nicholas P; Vickerman, John C

    2013-06-18

    Low secondary ion yields from organic and biological molecules are the principal limitation on the future exploitation of time of flight-secondary ion mass spectrometry (TOF-SIMS) as a surface and materials analysis technique. On the basis of the hypothesis that increasing the density of water related fragments in the ion impact zone would enhance proton mediated reactions, a prototype water cluster ion beam has been developed using supersonic jet expansion methodologies that enable ion yields using a 10 keV (H2O)1000(+) beam to be compared with those obtained using a 10 keV Ar1000(+) beam. The ion yields from four standard compounds, arginine, haloperidol, DPPC, and angiotensin II, have been measured under static+ and high ion dose conditions. Ion yield enhancements relative to the argon beam on the order of 10 or more have been observed for all the compounds such that the molecular ion yield per a 1 μm pixel can be as high as 20, relative to 0.05 under an argon beam. The water beam has also been shown to partially lift the matrix effect in a 1:10 mixture of haloperidol and dipalmitoylphosphatidylcholine (DPPC) that suppresses the haloperidol signal. These results provide encouragement that further developments of the water cluster beam to higher energies and larger cluster sizes will provide the ion yield enhancements necessary for the future development of TOF-SIMS.

  1. Effect of different ion beam energy on properties of amorphous carbon film fabricated by ion beam sputtering deposition (IBSD)

    NASA Astrophysics Data System (ADS)

    Bai, Lichun; Zhang, Guangan; Wu, Zhiguo; Wang, Jun; Yan, Pengxun

    2011-09-01

    Amorphous carbon (a-C) films were fabricated by ion beam sputtering technique. The influence of sputtering ion beam energy on bonding structure, morphologic, mechanical properties, tribological properties and corrosion resistance of a-C films are investigated systematically. Morphology study shows that lowest surface roughness exists for mid-ion beam energy. Improved adhesion is observed for the films that are prepared under high ion beam energy, attributed to film graphitization, low residual stress and mixed interface. Relatively, a-C films prepared with ion beam energy of 2 keV exhibits optimum sp 3 bond content, mechanical properties and corrosion resistance. It is found that the wear rate of DLC films decrease with increased ion beam energy in general, consistent with the varied trend of the H/ E value which has been regarded as a suitable parameter for predicting wear resistance of the coatings. The correlation of the sp 3 bond fraction in the films estimated from Raman spectroscopy with residual stress, nanohardness and corrosion resistance has been established.

  2. Biomaterial imaging with MeV-energy heavy ion beams

    NASA Astrophysics Data System (ADS)

    Seki, Toshio; Wakamatsu, Yoshinobu; Nakagawa, Shunichiro; Aoki, Takaaki; Ishihara, Akihiko; Matsuo, Jiro

    2014-08-01

    The spatial distribution of several chemical compounds in biological tissues and cells can be obtained with mass spectrometry imaging (MSI). In conventional secondary ion mass spectrometry (SIMS) with keV-energy ion beams, elastic collisions occur between projectiles and atoms of constituent molecules. The collisions produce fragments, making the acquisition of molecular information difficult. In contrast, ion beams with MeV-energy excite near-surface electrons and enhance the ionization of high-mass molecules; hence, SIMS spectra of fragment-suppressed ionized molecules can be obtained with MeV-SIMS. To compare between MeV and conventional SIMS, we used the two methods based on MeV and Bi3-keV ions, respectively, to obtain molecular images of rat cerebellum. Conventional SIMS images of m/z 184 were clearly observed, but with the Bi3 ion, the distribution of the molecule with m/z 772.5 could be observed with much difficulty. This effect was attributed to the low secondary ion yields and we could not get many signal counts with keV-energy beam. On the other hand, intact molecular ion distributions of lipids were clearly observed with MeV-SIMS, although the mass of all lipid molecules was higher than 500 Da. The peaks of intact molecular ions in MeV-SIMS spectra allowed us to assign the mass. The high secondary ion sensitivity with MeV-energy heavy ions is very useful in biomaterial analysis.

  3. Luminescent collisions of He+ and He++ ions with H2 molecules at energies below 2 keV

    NASA Astrophysics Data System (ADS)

    Pranszke, B.; Werbowy, S.; Miotk, R.; Borkowski, K. J.; Kowalski, A.

    2013-10-01

    Spectroscopic studies of collisions between He+ and He++ ions with H2 gas target have been performed in the 200-600 nm wavelength range. Atomic lines of hydrogen Balmer series and several helium lines were identified and their excitation functions between 50 eV and 1 keV (2 keV for He++) were determined.

  4. Use of axially symmetric electrostatic fields for ion-beam focussing

    SciTech Connect

    Colton, E.; Kelly, J.C.

    1983-01-01

    The 1/r electric field obtained between charged coaxial cylindrical electrodes is useful for focusing hollow ion beams in ion-microprobe and ion- implantation applications. The focusing strengths are mass-independent at nonrelativistic energies. Focused-particle densities can be enhanced by using a diverging-converging pair to flatten the dependence of focal length on incoming-beam radius. Transport of 425-keV and 1-MeV protons has been simulated and results are presented.

  5. Ion beam microtexturing of surfaces

    NASA Technical Reports Server (NTRS)

    Robinson, R. S.

    1981-01-01

    Some recent work in surface microtecturing by ion beam sputtering is described. The texturing is accomplished by deposition of an impurity onto a substrate while simultaneously bombarding it with an ion beam. A summary of the theory regarding surface diffusion of impurities and the initiation of cone formation is provided. A detailed experimental study of the time-development of individual sputter cones is described. A quasi-liquid coating was observed that apparently reduces the sputter rate of the body of a cone compared to the bulk material. Experimental measurements of surface diffusion activation energies are presented for a variety of substrate-seed combinations and range from about 0.3 eV to 1.2 eV. Observations of apparent crystal structure in sputter cones are discussed. Measurements of the critical temperature for cone formation are also given along with a correlation of critical temperature with substrate sputter rate.

  6. Ion beam effects in diacetylenes

    NASA Astrophysics Data System (ADS)

    Elman, B. S.; Blackburn, Gary F.; Thakur, M. K.; Sandman, D. J.; Samuelson, L. A.; Kenneson, D. G.

    Due to their unique backbone structure and crystalline organization, polydiacetylenes (PDAs) are considered to be prototype one-dimensional systems. They were shown to have properties considered important to realize concepts of all-optical signal processing. Macroscopic, nearly defect-free, highly anisotropic PDA single crystals are prepared by exposure of diacteylene monomers to various forms of radiation. These materials can also be prepared as thin film crystals and Langmuir-Blodgett (LB) assemblies. We have studied and compared the effects of ion beam irradiation on different configurations of diacetylenes: bulk crystals, thin films and LB structures. Exposure of monomeric diacetylene films to very low fiuence ion beams results in their polymerization and in the formation of good quality anisotropic films of controlled thickness. Significant changes in optical and electrical properties of PDAs were observed and studied by optical absorption and do temperature dependent conductivity measurements.

  7. Oxygen ion-beam microlithography

    DOEpatents

    Tsuo, Y. Simon

    1991-01-01

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used.

  8. Oxygen ion-beam microlithography

    DOEpatents

    Tsuo, Y.S.

    1991-08-20

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used. 5 figures.

  9. Optical studies of ion-beam synthesized metal alloy nanoparticles

    NASA Astrophysics Data System (ADS)

    Magudapathy, P.; Srivatsava, S. K.; Gangopadhyay, P.; Amirthapandian, S.; Sairam, T. N.; Panigrahi, B. K.

    2015-06-01

    AuxAg1-x alloy nanoparticles with tunable surface plasmon resonance (SPR) have been synthesized on a silica glass substrate. A small Au foil on an Ag foil is irradiated as target substrates such that ion beam falls on both Ag foil and Au foils. Silica slides are kept at an angle ˜45° with respect to the metallic foils. While irradiating the metallic foils with 100 keV Ar+ ions, sputtered Au and Ag atoms get deposited on the silica-glass. In this configuration the foils have been irradiated by Ar+ ions to various fluences at room temperature and the sputtered species are collected on silica slides. Formation of AuxAg1-x nanoparticles has been confirmed from the optical absorption measurements. With respect to the exposure area of Au and Ag foils to the ion beam, the SPR peak position varies from 450 to 500 nm. Green photoluminescence has been observed from these alloy metal nanoparticles.

  10. Ion beam inertial confinement target

    DOEpatents

    Bangerter, Roger O.; Meeker, Donald J.

    1985-01-01

    A target for implosion by ion beams composed of a spherical shell of frozen DT surrounded by a low-density, low-Z pusher shell seeded with high-Z material, and a high-density tamper shell. The target has various applications in the inertial confinement technology. For certain applications, if desired, a low-density absorber shell may be positioned intermediate the pusher and tamper shells.

  11. A large-acceptance beam-deceleration module for retrofitting into ion-source beam lines

    SciTech Connect

    Hijazi, H.; Meyer, F. W.

    2013-03-15

    We describe a large-acceptance deceleration module capable of decelerating large-emittance full-intensity ion beams typical of ECR ion sources to very low energies with high efficiency. The deceleration module is designed to permit convenient retrofitting into an existing beam line to replace, e.g., the first Faraday cup after magnetic analysis of the beam extracted from the ion source. For starting energies of 10 keV, and incident ion currents as large as 300 {mu}A, deceleration efficiencies have been measured to be greater than 80% for final energies as low as 70 eV. The decelerated beam intensity can be monitored either by insertion of a beam catcher floating at the final deceleration voltage or from the current to the exit grid itself, with suitable correction applied for the grid transparency factor. The behavior of the deceleration optics was modeled using SIMION, incorporating the effects of intra-beam space charge repulsion. We describe a recent application of this deceleration module to study near-surface He bubble and blister formation of a W target heated to 1250 K and irradiated with a 98 eV He ion beam with a flux of {approx}10{sup 16} cm{sup -2} s{sup -1}.

  12. Application of ion beams for polymeric carbon based biomaterials

    NASA Astrophysics Data System (ADS)

    Evelyn, A. L.

    2001-07-01

    Ion beams have been shown to be quite suitable for the modification and analysis of carbon based biomaterials. Glassy polymeric carbon (GPC), made from cured phenolic resins, has a high chemical inertness that makes it useful as a biomaterial in medicine for drug delivery systems and for the manufacture of heart valves and other prosthetic devices. Low and high-energy ion beams have been used, with both partially and fully cured phenolic resins, to enhance biological cell/tissue growth on, and to increase tissue adhesion to GPC surfaces. Samples bombarded with energetic ion beams in the keV to MeV range exhibited increased surface roughness, measured using optical microscopy and atomic force microscopy. Ion beams were also used to perform nuclear reaction analyses of GPC encapsulated drugs for use in internal drug delivery systems. The results from the high energy bombardment were more dramatic and are shown in this paper. The interaction of energetic ions has demonstrated the useful application of ion beams to enhance the properties of carbon-based biomaterials.

  13. Secondary ion yields produced by keV atomic and polyatomic ion impacts on a self-assembled monolayer surface

    PubMed

    Harris; Baker; Van Stipdonk MJ; Crooks; Schweikert

    1999-01-01

    A suite of keV polyatomic or 'cluster' projectiles was used to bombard unoxidized and oxidized self-assembled monolayer surfaces. Negative secondary ion yields, collected at the limit of single ion impacts, were measured and compared for both molecular and fragment ions. In contrast to targets that are orders of magnitude thicker than the penetration range of the primary ions, secondary ion yields from polyatomic projectile impacts on self-assembled monolayers show little to no enhancement when compared with monatomic projectiles at the same velocity. This unusual trend is most likely due to the structural arrangement and bonding characteristics of the monolayer molecules with the Au(111). Copyright 1999 John Wiley & Sons, Ltd.

  14. Development of a negative ion-based neutral beam injector in Novosibirsk

    NASA Astrophysics Data System (ADS)

    Ivanov, A. A.; Abdrashitov, G. F.; Anashin, V. V.; Belchenko, Yu. I.; Burdakov, A. V.; Davydenko, V. I.; Deichuli, P. P.; Dimov, G. I.; Dranichnikov, A. N.; Kapitonov, V. A.; Kolmogorov, V. V.; Kondakov, A. A.; Sanin, A. L.; Shikhovtsev, I. V.; Stupishin, N. V.; Sorokin, A. V.; Popov, S. S.; Tiunov, M. A.; Belov, V. P.; Gorbovsky, A. I.; Kobets, V. V.; Binderbauer, M.; Putvinski, S.; Smirnov, A.; Sevier, L.

    2014-02-01

    A 1000 keV, 5 MW, 1000 s neutral beam injector based on negative ions is being developed in the Budker Institute of Nuclear Physics, Novosibirsk in collaboration with Tri Alpha Energy, Inc. The innovative design of the injector features the spatially separated ion source and an electrostatic accelerator. Plasma or photon neutralizer and energy recuperation of the remaining ion species is employed in the injector to provide an overall energy efficiency of the system as high as 80%. A test stand for the beam acceleration is now under construction. A prototype of the negative ion beam source has been fabricated and installed at the test stand. The prototype ion source is designed to produce 120 keV, 1.5 A beam.

  15. Development of a negative ion-based neutral beam injector in Novosibirsk.

    PubMed

    Ivanov, A A; Abdrashitov, G F; Anashin, V V; Belchenko, Yu I; Burdakov, A V; Davydenko, V I; Deichuli, P P; Dimov, G I; Dranichnikov, A N; Kapitonov, V A; Kolmogorov, V V; Kondakov, A A; Sanin, A L; Shikhovtsev, I V; Stupishin, N V; Sorokin, A V; Popov, S S; Tiunov, M A; Belov, V P; Gorbovsky, A I; Kobets, V V; Binderbauer, M; Putvinski, S; Smirnov, A; Sevier, L

    2014-02-01

    A 1000 keV, 5 MW, 1000 s neutral beam injector based on negative ions is being developed in the Budker Institute of Nuclear Physics, Novosibirsk in collaboration with Tri Alpha Energy, Inc. The innovative design of the injector features the spatially separated ion source and an electrostatic accelerator. Plasma or photon neutralizer and energy recuperation of the remaining ion species is employed in the injector to provide an overall energy efficiency of the system as high as 80%. A test stand for the beam acceleration is now under construction. A prototype of the negative ion beam source has been fabricated and installed at the test stand. The prototype ion source is designed to produce 120 keV, 1.5 A beam.

  16. MEMS based ion beams for fusion

    NASA Astrophysics Data System (ADS)

    Persaud, A.; Seidl, P. A.; Ji, Q.; Waldron, W. L.; Schenkel, T.; Ardanuc, S.; Vinayakumar, K. B.; Schaffer, Z. A.; Lal, A.

    2016-10-01

    Micro-Electro-Mechanical Systems (MEMS) fabrication provides an exciting opportunity to shrink existing accelerator concepts to smaller sizes and to reduce cost by orders of magnitude. We revisit the concept of a Multiple Electrostatic Quadrupole Array Linear Accelerator (MEQALAC) and show how, with current technologies, the concept can be downsized from gap distances of several cm to distances in the sub-mm regime. The basic concept implements acceleration gaps using radio frequency (RF) fields and electrostatic quadrupoles (ESQ) on silicon wafers. First results from proof-of-concept experiments using printed circuit boards to realize the MEQALAC structures are presented. We show results from accelerating structures that were used in an array of nine (3x3) parallel beamlets with He ions at 15 keV. We will also present results from an ESQ focusing lattice using the same beamlet layout showing beam transport and matching. We also will discuss our progress in fabricating MEMS devices in silicon wafers for both the RF and ESQ structures and integration of necessary RF-circuits on-chip. The concept can be scaled up to thousands of beamlets providing high power beams at low cost and can be used to form and compress a plasma for the development of magnetized target fusion approaches. This work was supported by the Office of Science of the US Department of Energy through the ARPA-e ALPHA program under contracts DE-AC0205CH11231 (LBNL).

  17. Making channeling visible: keV noble gas ion trails on Pt(111)

    NASA Astrophysics Data System (ADS)

    Redinger, A.; Standop, S.; Rosandi, Y.; Urbassek, H. M.; Michely, T.

    2011-01-01

    The impact of argon and xenon noble gas ions on Pt(111) in grazing incidence geometry are studied through direct comparison of scanning tunneling microscopy images and molecular dynamics simulations. The energy range investigated is 1-15 keV and the angles of incidence with respect to the surface normal are between 78.5° and 88°. The focus of the paper is on events where ions gently enter the crystal at steps and are guided in channels between the top most layers of the crystal. The trajectories of the subsurface channeled ions are visible as trails of surface damage. The mechanism of trail formation is analyzed using simulations and analytical theory. Significant differences between Xe+ and Ar+ projectiles in damage, in the onset energy of subsurface channeling as well as in ion energy dependence of trail length and appearance are traced back to the projectile and ion energy dependence of the stopping force. The asymmetry of damage production with respect to the ion trajectory direction is explained through the details of the channel shape and subchannel structure as calculated from the continuum approximation of the channel potential. Measured and simulated channel switching in directions normal and parallel to the surface as well as an increase of ions entering into channels from the perfect surface with increasing angles of incidence are discussed.

  18. Reduction of a beam diameter by decreasing the divergence angle of an incident beam in a compact ion microbeam system producing several-hundred-keV beam

    NASA Astrophysics Data System (ADS)

    Ishii, Yasuyuki; Ohkubo, Takeru; Kamiya, Tomihiro

    2017-08-01

    A compact ion microbeam system, which comprises a three-stage acceleration lens and a duoplasmatron-type ion source and produces beam of several hundred kiloelectron-volts, has been developed to form a beam that has a diameter of several micrometers. Previous studies have indicated that a small divergence angle of an incident beam is required to improve the demagnification of the three-stage acceleration lens. A simulation of an ion beam extraction demonstrated that the optimum distance between the anode and the extraction electrode in the ion source could lead to an ion beam being generated with the smallest possible divergence angle. As a result, a hydrogen beam with a 2.6 μm diameter was experimentally produced at 120 keV.

  19. Ion-beam synthesis and photoluminescence of SiC nanocrystals assisted by MeV-heavy-ion-beam annealing

    NASA Astrophysics Data System (ADS)

    Khamsuwan, J.; Intarasiri, S.; Kirkby, K.; Chu, P. K.; Singkarat, S.; Yu, L. D.

    2012-07-01

    This work explored a novel way to synthesize silicon carbide (SiC) nanocrystals for photoluminescence. Carbon ions at 90 keV were implanted in single crystalline silicon wafers at elevated temperature, followed by irradiation using xenon ion beams at an energy of 4 MeV with two low fluences of 5 × 1013 and 1 × 1014 ions/cm2 at elevated temperatures for annealing. X-ray diffraction, Raman scattering, infrared spectroscopy and transmission electron microscopy were used to characterize the formation of nanocrystalline SiC. Photoluminescence was measured from the samples. The results demonstrated that MeV-heavy-ion-beam annealing could indeed induce crystallization of SiC nanocrystals and enhance emission of photoluminescence with violet bands dominance due to the quantum confinement effect.

  20. Extraction design and low energy beam transport optimization of space charge dominated multispecies ion beam sources

    NASA Astrophysics Data System (ADS)

    Delferrière, O.; De Menezes, D.

    2004-05-01

    In all accelerator projects, the low energy part of the accelerator has to be carefully optimized to match the beam characteristic requirements of the higher energy parts. Since 1994 with the beginning of the Injector of Protons for High Intensity (IPHI) project and Source of Light Ions with High Intensities (SILHI) electron cyclotron resonance (ECR) ion source development at CEA/Saclay, we are using a set of two-dimensional (2D) codes for extraction system optimization (AXCEL, OPERA-2D) and beam transport (MULTIPART). The 95 keV SILHI extraction system optimization has largely increased the extracted current, and improved the beam line transmission. From these good results, a 130 mA D+ extraction system for the International Fusion Material Irradiation Facility project has been designed in the same way as SILHI one. We are also now involved in the SPIRAL 2 project for the building of a 40 keV D+ ECR ion source, continuously tunable from 0.1 to 5 mA, for which a special four-electrode extraction system has been studied. In this article we will describe the 2D design process and present the different extraction geometries and beam characteristics. Simulation results of SILHI H+ beam emittance will be compared with experimental measurements.

  1. A Nanoscale-Localized Ion Damage Josephson Junction Using Focused Ion Beam and Ion Implanter.

    PubMed

    Wu, C H; Ku, W S; Jhan, F J; Chen, J H; Jeng, J T

    2015-05-01

    High-T(c) Josephson junctions were fabricated by nanolithography using focused ion beam (FIB) milling and ion implantation. The junctions were formed in a YBa2Cu3O7-x, thin film in regions defined using a gold-film mask with 50-nm-wide (top) slits, engraved by FIB. The focused ion beam system parameters for dwell time and passes were set to remove gold up to a precise depth. 150 keV oxygen ions were implanted at a nominal dose of up to 5 x 10(13) ions/cm2 into YBa2Cu3O7-x microbridges through the nanoscale slits. The current-voltage curves of the ion implantation junctions exhibit resistive-shunted-junction-like behavior at 77 K. The junction had an approximately linear temperature dependence of critical current. Shapiro steps were observed under microwave irradiation. A 50-nm-wide slit and 0-20-nm-thick buffer layers were chosen in order to make Josephson junctions due to the V-shape of the FIB-milled trench.

  2. Neurosurgical applications of ion beams

    NASA Astrophysics Data System (ADS)

    Fabrikant, Jacob I.; Levy, Richard P.; Phillips, Mark H.; Frankel, Kenneth A.; Lyman, John T.

    1989-04-01

    The program at Donner Pavilion has applied nuclear medicine research to the diagnosis and radiosurgical treatment of life-threatening intracranial vascular disorders that affect more than half a million Americans. Stereotactic heavy-charged-particle Bragg peak radiosurgery, using narrow beams of heavy ions, demonstrates superior biological and physical characteristics in brain over X-and γ-rays, viz., improved dose distribution in the Bragg peak and sharp lateral and distal borders and less scattering of the beam. Examination of CNS tissue response and alteration of cerebral blood-flow dynamics related to heavy-ion Bragg peak radiosurgery is carried out using three-dimensional treatment planning and quantitative imaging utilizing cerebral angiography, computerized tomography (CT), magnetic resonance imaging (MRI), cine-CT, xenon X-ray CT and positron emission tomography (PET). Also under examination are the physical properties of narrow heavy-ion beams for improving methods of dose delivery and dose distribution and for establishing clinical RBE/LET and dose-response relationships for human CNS tissues. Based on the evaluation and treatment with stereotactically directed narrow beams of heavy charged particles of over 300 patients, with cerebral angiography, CT scanning and MRI and PET scanning of selected patients, plus extensive clinical and neuroradiological followup, it appears that Stereotactic charged-particle Bragg peak radiosurgery obliterates intracranial arteriovenous malformations or protects against rebleeding with reduced morbidity and no mortality. Discussion will include the method of evaluation, the clinical research protocol, the Stereotactic neuroradiological preparation, treatment planning, the radiosurgery procedure and the protocol for followup. Emphasis will be placed on the neurological results, including the neuroradiological and clinical response and early and late delayed injury in brain leading to complications (including vasogenic edema

  3. Production and acceleration of ion beams by laser ablation.

    PubMed

    Velardi, L; Siciliano, M V; Delle Side, D; Nassisi, V

    2012-02-01

    In this work, we present a new pulsed laser ablation technique to obtain energetic ion beams. The accelerator we made is a compact device able to extract and accelerate the ionic components of plasma up to 160 keV per charge state. It is composed by a generating chamber containing an expansion chamber used like first electrode. Next, a second electrode connected to ground and a third electrode connected to negative voltage are used. The third electrode is used also as Faraday cup. By the analysis of the ion signals we studied the plume parameters such as TOF accelerated signals, charge state, and divergence.

  4. Spectra of KeV Protons Related to Ion-Cyclotron Wave Packets

    NASA Technical Reports Server (NTRS)

    Khazanov, G. V.; Sibeck, D. G.; Tel'Nikhin, A. A.; Kronberg, T. K.

    2017-01-01

    We use the Fokker-Planck-Kolmogorov equation to study the statistical aspects of stochastic dynamics of the radiation belt (RB) protons driven by nonlinear electromagnetic ion-cyclotron (EMIC) wave packets. We obtain the spectra of keV protons scattered by these waves that showsteeping near the gyroresonance, the signature of resonant wave-particle interaction that cannot be described by a simple power law. The most likely mechanism for proton precipitation events in RBs is shown to be nonlinear wave-particle interaction, namely, the scattering of RB protons into the loss cone by EMIC waves.

  5. Production of negatively charged radioactive ion beams

    NASA Astrophysics Data System (ADS)

    Liu, Y.; Stracener, D. W.; Stora, T.

    2017-08-01

    Beams of short-lived radioactive nuclei are needed for frontier experimental research in nuclear structure, reactions, and astrophysics. Negatively charged radioactive ion beams have unique advantages and allow for the use of a tandem accelerator for post-acceleration, which can provide the highest beam quality and continuously variable energies. Negative ion beams can be obtained with high intensity and some unique beam purification techniques based on differences in electronegativity and chemical reactivity can be used to provide beams with high purity. This article describes the production of negative radioactive ion beams at the former holifield radioactive ion beam facility at Oak Ridge National Laboratory and at the CERN ISOLDE facility with emphasis on the development of the negative ion sources employed at these two facilities. ).

  6. Focused electron and ion beam systems

    DOEpatents

    Leung, Ka-Ngo; Reijonen, Jani; Persaud, Arun; Ji, Qing; Jiang, Ximan

    2004-07-27

    An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.

  7. Effects on focused ion beam irradiation on MOS transistors

    SciTech Connect

    Campbell, A.N.; Peterson, K.A.; Fleetwood, D.M.; Soden, J.M.

    1997-04-01

    The effects of irradiation from a focused ion beam (FIB) system on MOS transistors are reported systematically for the first time. Three MOS transistor technologies, with 0.5, 1, and 3 {mu}m minimum feature sizes and with gate oxide thicknesses ranging from 11 to 50 nm, were analyzed. Significant shifts in transistor parameters (such as threshold voltage, transconductance, and mobility) were observed following irradiation with a 30 keV Ga{sup +} focused ion beam with ion doses varying by over 5 orders of magnitude. The apparent damage mechanism (which involved the creation of interface traps, oxide trapped charge, or both) and extent of damage were different for each of the three technologies investigated.

  8. Nanostructured Arrays Formed by Finely Focused Ion Beams

    SciTech Connect

    Budai, J.D.; Datsos, P.G.; Feldman, L.C.; Heinig, K.-H.; Meldrum, A.; Strobel, M.; Thomas, K.A.; Warmack, R.J.; White, C.W.; Zuhr, R.A.

    1998-11-30

    Amorphous, polycrystalline, and single crystal nanometer dimension particles can be formed in a variety of substrates by ion implantation and subsequent annealing. Such composite colloidal materials exhibit unique optical properties that could be useful in optical devices, switches, and waveguides. However colloids formed by blanket implantation are not uniform in size due to the nonuniform density of the implant, resulting in diminution of the size dependent optical properties. The object of the present work is to form more uniform size particles arranged in a 2-dimensional lattice by using a finely focused ion beam to implant identical ion doses only into nanometer size regions located at each point of a rectangular lattice. Initial work is being done with a 30 keV Ga beam implanted into Si. Results of particle formation as a function of implant conditions as analyzed by Rutherford backscattering, x-ray analysis, atomic force microscopy, and both scanning and transmission electron microscopy will be presented and discussed.

  9. Nonlinear optical properties of Cu nanocluster composite fabricated by 180 keV ion implantation

    NASA Astrophysics Data System (ADS)

    Wang, Y. H.; Wang, Y. M.; Lu, J. D.; Ji, L. L.; Zang, R. G.; Wang, R. W.

    2009-11-01

    Metal nanocluster composite glass prepared by 180 keV Cu ions into silica with dose of 5×10 16 ions/cm 2 has been studied. The microstructural properties of the nanoclusters has been verified by optical absorption spectra and transmission electron microscopy (TEM). Third-order nonlinear optical properties of the nanoclusters were measured at 1064 and 532 nm excitations using Z-scan technique. The nonlinear refraction index, nonlinear absorption coefficient, and the real and imaginary parts of the third-order nonlinear susceptibility were deduced. Results of the investigation of nonlinear refraction by the off-axis Z-scan configuration were presented and the mechanisms responsible for the nonlinear response were discussed. Third-order nonlinear susceptibility χ(3) of this kind of sample was determined to be 8.7×10 -8 esu at 532 nm and 6.0×10 -8 esu at 1064 nm, respectively.

  10. Nanofabrication by Focused Ion Beam

    DTIC Science & Technology

    1993-09-28

    MASTER COPY KEEP THIS COPY FOR REPRODUCTION PURPOSES AD-A271 290 )N PAGE orhan Sand .01fMI.,r re ~’.nq tn., Oiurda N0o.me 0& Of .018l 04v~~t P - .L...Institute of Technology Cambridge, MA 02139 APPROVED FOR PUBLIC RELEASE; N, S c; . DISTRIBUTION UNLIMITED u..d.. `. B y .. . . . . . .. Dist A-jr I...defined sidewalls indicate that much finer lithography would be possible with a1 more optimum beam. b ) Preferential Oxide growth after ion exposure. (In

  11. Ionization and fragmentation of polycyclic aromatic hydrocarbon clusters in collisions with keV ions

    SciTech Connect

    Johansson, H. A. B.; Zettergren, H.; Holm, A. I. S.; Seitz, F.; Schmidt, H. T.; Cederquist, H.; Rousseau, P.; Lawicki, A.; Capron, M.; Domaracka, A.; Lattouf, E.; Maclot, S.; Maisonny, R.; Chesnel, J.-Y.; Adoui, L.; Huber, B. A.

    2011-10-15

    We report on an experimental study of the ionization and fragmentation of clusters of k polycyclic aromatic hydrocarbon (PAH) molecules using anthracene, C{sub 14}H{sub 10}, or coronene, C{sub 24}H{sub 12}. These PAH clusters are moderately charged and strongly heated in small impact parameter collisions with 22.5-keV He{sup 2+} ions, after which they mostly decay in long monomer evaporation sequences with singly charged and comparatively cold monomers as dominating end products. We describe a simple cluster evaporation model and estimate the number of PAH molecules in the clusters that have to be hit by He{sup 2+} projectiles for such complete cluster evaporations to occur. Highly charged and initially cold clusters are efficiently formed in collisions with 360-keV Xe{sup 20+} ions, leading to cluster Coulomb explosions and several hot charged fragments, which again predominantly yield singly charged, but much hotter, monomer ions than the He{sup 2+} collisions. We present a simple formula, based on density-functional-theory calculations, for the ionization energy sequences as functions of coronene cluster size, rationalized in terms of the classic electrostatic expression for the ionization of a charged conducting object. Our analysis indicates that multiple electron removal by highly charged ions from a cluster of PAH molecules rapidly may become more important than single ionization as the cluster size k increases and that this is the main reason for the unexpectedly strong heating in these types of collisions.

  12. Ionization and fragmentation of cold clusters of PAH molecules - collisions with keV ions

    NASA Astrophysics Data System (ADS)

    Holm, A. I. S.; Zettergren, H.; Gatchell, M.; Johansson, H. A. B.; Seitz, F.; Schmidt, H. T.; Rousseau, P.; Ławicki, A.; Capron, M.; Domaracka, A.; Lattouf, E.; Maclot, S.; Maisonny, R.; Chesnel, J.-Y.; Manil, B.; Adoui, L.; Huber, B. A.; Cederquist, H.

    2012-11-01

    We discuss the ionization and fragmentation of isolated monomers and cold clusters of polycyclic aromatic hydrocarbon (PAH) molecules in collisions with keV ions in low or high charge states. With low charge state projectile ions, PAH cluster or monomer targets are thermally excited through electronic stopping processes directly in close peripheral or penetrating collisions while only single or few electrons are removed. With high charge state projectiles, electrons are very effectively removed from both the cluster and the monomer target already at very large distances with very little direct target heating. Singly charged and internally very hot PAH monomers are dominant fragmentation products following collisions between Xe20+ ions and PAH clusters. We suggest that this due to an unusually strong dominance of multiple-ionization over single ionization for PAH clusters interacting with highly charged ions. Here, charge and excitation energy is very rapidly redistributed within the clusters before they Coulomb explode and we suggest that these Coulomb explosions induce strong internal heating in the individual PAH molecules. We thus conclude that PAH cluster fragmentation always dominates strongly for all ionization processes regardless if these are due to interactions with ions in high or low charge states. These findings are discussed in view of simple models for cluster evaporation or single and multiple ionizations of PAH clusters.

  13. Mapping of ion beam induced current changes in FinFETs

    SciTech Connect

    Weis, C. D.; Schuh, A.; Batra, A.; Persaud, A.; Rangelow, I. W.; Bokor, J.; Lo, C. C.; Cabrini, S.; Olynick, D.; Duhey, S.; Schenkel, T.

    2008-09-30

    We report on progress in ion placement into silicon devices with scanning probealignment. The device is imaged with a scanning force microscope (SFM) and an aligned argon beam (20 keV, 36 keV) is scanned over the transistor surface. Holes in the lever of the SFM tip collimate the argon beam to sizes of 1.6 mu m and 100 nm in diameter. Ion impacts upset the channel current due to formation of positive charges in the oxide areas. The induced changes in the source-drain current are recorded in dependence of the ion beam position in respect to the FinFET. Maps of local areas responding to the ion beam are obtained.

  14. Pseudo ribbon metal ion beam source

    SciTech Connect

    Stepanov, Igor B. Ryabchikov, Alexander I.; Sivin, Denis O.; Verigin, Dan A.

    2014-02-15

    The paper describes high broad metal ion source based on dc macroparticle filtered vacuum arc plasma generation with the dc ion-beam extraction. The possibility of formation of pseudo ribbon beam of metal ions with the parameters: ion beam length 0.6 m, ion current up to 0.2 A, accelerating voltage 40 kV, and ion energy up to 160 kV has been demonstrated. The pseudo ribbon ion beam is formed from dc vacuum arc plasma. The results of investigation of the vacuum arc evaporator ion-emission properties are presented. The influence of magnetic field strength near the cathode surface on the arc spot movement and ion-emission properties of vacuum-arc discharge for different cathode materials are determined. It was shown that vacuum-arc discharge stability can be reached when the magnetic field strength ranges from 40 to 70 G on the cathode surface.

  15. The electromagnetic ion cyclotron beam anisotropy instability

    NASA Technical Reports Server (NTRS)

    Peter Gary, S.; Schriver, David

    1987-01-01

    Electromagnetic instabilities driven by an anisotropic, relatively cool ion beam are studied for the case in which both the beam and the instabilities propagate parallel or antiparallel to a uniform magnetic field. At modest beam-core relative drift speeds, sufficiently large perpendicular-to-parallel beam temperature ratios and sufficiently large plasma beta, the mode of fastest growth rate is the ion cyclotron beam anisotropy instability. Because the right-hand polarized waves observed upstream of slow shocks in the earth's magnetotail can lead to the appropriate beam anisotropy, the ion cyclotron instability may be present and account for the left-hand polarized magnetic waves observed there. Also, because of its relatively low phase speed, the ion cyclotron beam anisotropy instability may provide the scattering necessary for ion Fermi acceleration at slow shocks of sufficiently high plasma beta.

  16. Negative Ion Beam Extraction and Emittance

    SciTech Connect

    Holmes, Andrew J. T.

    2007-08-10

    The use of magnetic fields to both aid the production of negative ions and suppress the co-extracted electrons causes the emittance and hence the divergence of the negative ion beam to increase significantly due to the plasma non-uniformity from jxB drift. This drift distorts the beam-plasma meniscus and experimental results of the beam emittance are presented, which show that non-uniformity causes the square of the emittance to be proportional to the 2/3 power of the extracted current density. This can cause the divergence of the negative ion beam to be significantly larger than its positive ion counterpart. By comparing results from positive and negative ion beam emittances from the same source, it is also possible to draw conclusions about their vulnerability to magnetic effects. Finally emittances of caesiated and un-caesiated negative ion beams are compared to show how the surface and volume modes of production interact.

  17. Low energy ion beam induced changes in structural and thermal properties of polycarbonate

    NASA Astrophysics Data System (ADS)

    Reheem, A. M. Abdel; Atta, A.; Maksoud, M. I. A. Abdel

    2016-10-01

    The aim of the present study is extended for obtaining relation between the collision of ion beam with polycarbonate polymer (PC) and the introduced modification of technological applications. Polycarbonate films are irradiated by a 6 keV argon ion beam extracted from locally design cold cathode ion source with different ion fluences. The films are characterized using X-ray Diffraction (XRD), Mechanical tester, Differential Scanning Calorimetry (DSC) and Thermogravimetric Analysis (TGA). The increase in ion beam irradiation leads to an increase in the tensile strength and reduction in elongation at break for PC. TGA Analysis shows that the thermal decomposition temperature of irradiated polycarbonate changes with ion fluence. The DSC graphs show improvements in thermal stability with increase in the activation energy after ion beam irradiation. Ion penetration depths and distributions of scattered atoms are calculated using SRIM Monte Carlo simulation programs.

  18. FABRICATION OF BISMUTH NANOWIRE DEVICES USING FOCUSED ION BEAM MILLING

    SciTech Connect

    Cheng, H. H.; Alkaisi, M. M.; Wu, S. E.; Liu, C. P.

    2009-07-23

    In this work, a focused ion beam (FIB) milling process has been developed to fabricate 50 nm Bi nanowire and transistor structures using FEI-200 dual beam FIB system. For the fabrication, 50 nm bismuth film was thermally evaporated through EBL patterned PMMA windows onto SiO{sub 2} substrates with pre-defined contact pads. Bi nanowire widths ranging from 30 nm to 100 nm have been successfully fabricated by milling out unwanted areas using 30 KeV Ga+ ion beam. A single-pixel-line ion beam blanking technique has been utilised to fabricate Bi nanowire as small as 30 nm in diameter and few micrometers long. In order to form good ohmic contacts for sub 50 nm bismuth nanowires, a drill-and-fill process has been developed using FIB to sputter away the surface oxide of bismuth after the in-situ platinum nanowire contacts deposition. To our knowledge, this is the first time a focused ion beam process has been used to fabricate bismuth nanowire. The fabricated Bi nanowires were electrically characterised using a semiconductor analyser that showed good ohmic contact to the electrodes. In this paper, the fabrication experiments and the characterisation results for Bi nanowires as small as 50 nm in diameter are presented. Several FIB issues involved in Bi device making and ohmic contacts to Bi nanowires will also be discussed.

  19. Laser ion source for high brightness heavy ion beam

    SciTech Connect

    Okamura, M.

    2016-09-01

    A laser ion source is known as a high current high charge state heavy ion source. But, we place great emphasis on the capability to realize a high brightness ion source. A laser ion source has a pinpoint small volume where materials are ionized and can achieve quite uniform low temperature ion beam. Those features may enable us to realize very small emittance beams. Furthermore, a low charge state high brightness laser ion source was successfully commissioned in Brookhaven National Laboratory in 2014. Now most of all the solid based heavy ions are being provided from the laser ion source for regular operation.

  20. Laser ion source for high brightness heavy ion beam

    DOE PAGES

    Okamura, M.

    2016-09-01

    A laser ion source is known as a high current high charge state heavy ion source. But, we place great emphasis on the capability to realize a high brightness ion source. A laser ion source has a pinpoint small volume where materials are ionized and can achieve quite uniform low temperature ion beam. Those features may enable us to realize very small emittance beams. Furthermore, a low charge state high brightness laser ion source was successfully commissioned in Brookhaven National Laboratory in 2014. Now most of all the solid based heavy ions are being provided from the laser ion sourcemore » for regular operation.« less

  1. Laser ion source for high brightness heavy ion beam

    SciTech Connect

    Okamura, M.

    2016-09-01

    A laser ion source is known as a high current high charge state heavy ion source. But, we place great emphasis on the capability to realize a high brightness ion source. A laser ion source has a pinpoint small volume where materials are ionized and can achieve quite uniform low temperature ion beam. Those features may enable us to realize very small emittance beams. Furthermore, a low charge state high brightness laser ion source was successfully commissioned in Brookhaven National Laboratory in 2014. Now most of all the solid based heavy ions are being provided from the laser ion source for regular operation.

  2. Laser ion source for high brightness heavy ion beam

    NASA Astrophysics Data System (ADS)

    Okamura, M.

    2016-09-01

    A laser ion source is known as a high current high charge state heavy ion source. However we place great emphasis on the capability to realize a high brightness ion source. A laser ion source has a pinpoint small volume where materials are ionized and can achieve quite uniform low temperature ion beam. Those features may enable us to realize very small emittance beams. In 2014, a low charge state high brightness laser ion source was successfully commissioned in Brookhaven National Laboratory. Now most of all the solid based heavy ions are being provided from the laser ion source for regular operation.

  3. A Multicusp Ion Source for Radioactive Ion Beams

    NASA Astrophysics Data System (ADS)

    Wutte, D.; Freedman, S.; Gough, R.; Lee, Y.; Leitner, M.; Leung, K. N.; Lyneis, C.; Picard, D. S.; Sun, L.; Williams, M. D.; Xie, Z. Q.

    1997-05-01

    In order to produce a radioactive ion beam of (14)O+, a 10-cm-diameter, 13.56 MHz radio frequency (rf) driven multicusp ion source is now being developed at Lawrence Berkeley National Laboratory. In this paper we describe the specific ion source design and the basic ion source characteristics using Ar, Xe and a 90types of measurements have been performed: extractable ion current, ion species distributions, gas efficiency, axial energy spread and ion beam emittance measurements. The source can generate ion current densities of approximately 60 mA/cm2 . In addition the design of the ion beam extraction/transport system for the actual experimental setup for the radioactive beam line will be presented.

  4. Broad-beam, high current, metal ion implantation facility

    SciTech Connect

    Brown, I.G.; Dickinson, M.R.; Galvin, J.E.; Godechot, X.; MacGill, R.A.

    1990-07-01

    We have developed a high current metal ion implantation facility with which high current beams of virtually all the solid metals of the Periodic Table can be produced. The facility makes use of a metal vapor vacuum arc ion source which is operated in a pulsed mode, with pulse width 0.25 ms and repetition rate up to 100 pps. Beam extraction voltage is up to 100 kV, corresponding to an ion energy of up to several hundred keV because of the ion charge state multiplicity; beam current is up to several Amperes peak and around 10 mA time averaged delivered onto target. Implantation is done in a broad-beam mode, with a direct line-of-sight from ion source to target. Here we describe the facility and some of the implants that have been carried out using it, including the seeding' of silicon wafers prior to CVD with titanium, palladium or tungsten, the formation of buried iridium silicide layers, and actinide (uranium and thorium) doping of III-V compounds. 16 refs., 6 figs.

  5. Plasma formed ion beam projection lithography system

    DOEpatents

    Leung, Ka-Ngo; Lee, Yung-Hee Yvette; Ngo, Vinh; Zahir, Nastaran

    2002-01-01

    A plasma-formed ion-beam projection lithography (IPL) system eliminates the acceleration stage between the ion source and stencil mask of a conventional IPL system. Instead a much thicker mask is used as a beam forming or extraction electrode, positioned next to the plasma in the ion source. Thus the entire beam forming electrode or mask is illuminated uniformly with the source plasma. The extracted beam passes through an acceleration and reduction stage onto the resist coated wafer. Low energy ions, about 30 eV, pass through the mask, minimizing heating, scattering, and sputtering.

  6. Kinetic Simulations of Ion Beam Neutralization

    SciTech Connect

    Wang, Joseph

    2010-05-21

    Ion beam emission/neutralization is one of the most fundamental problems in spacecraft plasma interactions and electric propulsion. Although ion beam neutralization is readily achieved in experiments, the understanding of the underlying physical process remains at a rather primitive level. No theoretical or simulation models have convincingly explained the detailed neutralization mechanism, and no conclusions have been reached. This paper presents a fully kinetic simulation of ion beam neutralization and plasma beam propagation and discusses the physics of electron-ion coupling and the resulting propagation of a neutralized mesothermal plasma.

  7. The Electron Beam Ion Source (EBIS)

    SciTech Connect

    Brookhaven Lab

    2009-06-09

    Brookhaven National Lab has successfully developed a new pre-injector system, called the Electron Beam Ion Source, for the Relativistic Heavy Ion Collider (RHIC) and NASA Space Radiation Laboratory science programs. The first of several planned improvemen

  8. The Electron Beam Ion Source (EBIS)

    ScienceCinema

    Brookhaven Lab

    2016-07-12

    Brookhaven National Lab has successfully developed a new pre-injector system, called the Electron Beam Ion Source, for the Relativistic Heavy Ion Collider (RHIC) and NASA Space Radiation Laboratory science programs. The first of several planned improvemen

  9. Fabrication of a polymer with three-dimensional structure by the ion beam graft polymerization method

    NASA Astrophysics Data System (ADS)

    Taniike, Akira; Kida, Yasutomo; Furuyama, Yuichi; Kitamura, Akira

    2011-12-01

    The graft polymerization method is one of the most effective techniques to produce a new polymer with unique function. To produce the polymer, we conducted experiments on radiation graft polymerization using ion beams of several hundred keV energy. A high density polyethylene (PE) film was irradiated with H + beams, then, graft polymerization with monomer solution such as acrylic acid or acrylonitrile was conducted. Radicals generated by the interaction between the beam ions and the PE molecules become the starting point of the graft polymerization. Since the range in PE depends on ion energy, the density distribution of the graft chain can be controlled by the ion energy. Using a mask which restricts the ion beam incidence, PE sheets containing graft chains only in the unmasked area were obtained. Multiple ion beam graft polymerization can produce a polymer which has some functional bases at specified position. We have demonstrated the production of a polymer film with a three-dimensional structure.

  10. Ion Beam Nanostructuring of HgCdTe Ternary Compound

    NASA Astrophysics Data System (ADS)

    Smirnov, Aleksey B.; Savkina, Rada K.; Udovytska, Ruslana S.; Gudymenko, Oleksandr I.; Kladko, Vasyl P.; Korchovyi, Andrii A.

    2017-05-01

    Systematic study of mercury cadmium telluride thin films subjected to the ion beam bombardment was carried out. The evolution of surface morphology of (111) Hg1 - x Cd x Te ( x 0.223) epilayers due to 100 keV B+ and Ag+ ion irradiation was studied by AFM and SEM methods. X-ray photoelectron spectroscopy and X-ray diffraction methods were used for the investigation of the chemical compound and structural properties of the surface and subsurface region. It was found that in the range of nanoscale, arrays of holes and mounds on Hg0.777Cd0.223Te (111) surface as well as the polycrystalline Hg1 - x Cd x Te cubic phase with alternative compound ( x 0.20) have been fabricated using 100 keV ion beam irradiation of the basic material. Charge transport investigation with non-stationary impedance spectroscopy method has shown that boron-implanted structures are characterized by capacity-type impedance whereas for silver-implanted structures, an inductive-type impedance (or "negative capacitance") is observed. A hybrid system, which integrates the nanostructured ternary compound (HgCdTe) with metal-oxide (Ag2O) inclusions, was fabricated by Ag+ ion bombardment. The sensitivity of such metal-oxide-semiconductor hybrid structure for sub-THz radiation was detected with NEP 4.5 × 10-8 W/Hz1/2at ν ≈ 140 GHz and 296 K without amplification.

  11. Ion beam modification of chitosan and cellulose membranes for simulation of ion bombardment of plant cell envelope

    NASA Astrophysics Data System (ADS)

    Prakrajang, K.; Wanichapichart, P.; Anuntalabhochai, S.; Pitakrattananukool, S.; Yu, L. D.

    2009-05-01

    Ion beam biotechnology has been developed for induction of DNA transfer into biological cells. To separately investigate effects of ion interaction with plant cell envelope for understanding relevant mechanisms, this study used chitosan and cellulose membranes to simulate the cell envelope and characterize behavior of the membranes modified by ion beam. Chitosan and cellulose membranes were bombarded with argon and nitrogen ion beams at energy of 15-25 keV to fluencies in orders of 1015 ion/cm2. Modifications of the membrane surface morphology, contact angle and electric characteristics were investigated. Results showed that subjected to ion bombardment, the membrane surface was roughened, the contact angle of the membrane surface was varied, the membrane impedance was decreased and the conductance and capacitance were increased. These modifications explain effects of ion bombardment of plant cell envelope on induction of DNA transfer.

  12. Laser cooling of a stored ion beam: A first step towards crystalline beams

    SciTech Connect

    Hangst, J.S.

    1992-09-01

    This report discusses: a brief introduction to storage rings; crystalline beams; laser cooling of ion beams; description of astrid-the experimental setup; first experiments with lithium 7 ion beam; experiments with erbium 166 ion beams; further experiments with lithium 7 ion beams; beam dynamics, laser cooling,and crystalline beams in astrid; possibilities for further study in astrid.

  13. Mechanisms of O2 Sputtering from Water Ice by keV Ions

    NASA Technical Reports Server (NTRS)

    Teolis, B. D.; Vidal, R. A.; Shi, J.; Baragiola, R. A.

    2005-01-01

    We have conducted experiments on the sputtering of water ice by 100 keV Ar(+) between 20 and 150 K. Our findings indicate that the temperature dependence of the total sputtering yield is heavily influenced by the thermal and irradiation history of the ice, showing a complex dependence on irradiation fluence that is correlated to the ejection of O2 molecules. The results suggest that O2 produced by the ions inside the ice diffuses to the surface where it is trapped and then ejected via sputtering or thermal desorption. A high concentration of O2 can trap in a subsurface layer during bombardment at 130 K, which we relate to the formation of hydrogen and its escape from that region. A simple model allows us to determine the depth profile of the absolute concentration of O2 trapped in the ice.

  14. Mechanisms of O2 Sputtering from Water Ice by keV Ions

    NASA Technical Reports Server (NTRS)

    Teolis, B. D.; Vidal, R. A.; Shi, J.; Baragiola, R. A.

    2005-01-01

    We have conducted experiments on the sputtering of water ice by 100 keV Ar(+) between 20 and 150 K. Our findings indicate that the temperature dependence of the total sputtering yield is heavily influenced by the thermal and irradiation history of the ice, showing a complex dependence on irradiation fluence that is correlated to the ejection of O2 molecules. The results suggest that O2 produced by the ions inside the ice diffuses to the surface where it is trapped and then ejected via sputtering or thermal desorption. A high concentration of O2 can trap in a subsurface layer during bombardment at 130 K, which we relate to the formation of hydrogen and its escape from that region. A simple model allows us to determine the depth profile of the absolute concentration of O2 trapped in the ice.

  15. ECR Based Low Energy Ion Beam Facility at VECC, Kolkata

    NASA Astrophysics Data System (ADS)

    Taki, G. S.; Chakraborty, D. K.; Ghosh, Subhash; Majhi, S.; Pal, Gautam; Mallik, C.; Bhandari, R. K.; Krishna, J. B. M.; Dey, K.; Sinha, A. K.

    2012-11-01

    A low energy heavy ion irradiation/implantation facility has been developed at VECC, Kolkata for materials science and atomic physics research, utilizing indigenously developed 6.4 GHz ECR ion source. The facility provides high charge state ion beams of N, O, Ne, Ar, S, Kr, Xe, Fe, Ti, Hf etc. up to a few micro amperes to an energy of 10 keV per charge state.The beam energy can be further enhanced by floating the target at a negative potential (up to 25 kV). The ion beam is focused to a spot of about 2 mm diameter on the target using a set of glaser lenses. A x-y scanner is used to scan the beam over a target area of 10 mm x 10 mm to obtain uniform implantation. The recently commissioned multi facility sample chamber has provision for mounting multiple samples on indigenously developed disposable beam viewers for insitu beam viewing during implantation. The ionization chamber of ECR source is mainly pumped by ECR plasma. An additional pumping speed has been provided through extraction hole and pumping slots to obtain low base pressure. In the ion source, base pressure of 1x10-7 Torr in injector stage and ~5x10-8 Torr in extraction chamber have been routinely obtained. The ultra-high vacuum multi facility experimental chamber is generally kept at ~ 1x10-7 Torr during implantation on the targets. This facility is a unique tool for studying fundamental and technologically important problems of materials science and atomic physics research. High ion flux available from this machine is suitable for generating high defect densities i.e. high value of displacement-per-atom (dpa). Recently this facility has been used for studies like "Tunability of dielectric constant of conducting polymer Polyaniline (PANI) by low energy Ar9+ irradiation" and "Fe10+ implantation in ZnO for synthesis of dilute magnetic semiconductor".

  16. Inner Magnetosphere keV Ion Drift Path Boundaries as Observed by the Van Allen Probes

    NASA Astrophysics Data System (ADS)

    Strangeway, R. J.; Zhang, J.; Larsen, B.

    2014-12-01

    The drifts of keV ions in the inner magnetosphere are controlled by both electric field drifts and gradient and curvature (i.e., magnetic field) drifts, and further the magnetic field drifts oppose the corotation electric field drift in the dusk local time sector. Consequently, the ion drift paths can be quite complicated with the medium-energy ions drifting close to the Earth, but still being on open drift paths. In addition, structure in the energy-time spectrograms can be a consequence of either particle injection or particle loss. In order to distinguish between the two we will compare the energy-time spectrograms acquired with the Helium Oxygen Proton Electron (HOPE) mass spectrometer on board the Van Allen Probes with predictions of drift path boundaries. The simplest model assumes a uniform convection electric field and dipole model field, and we will use this a starting point for the comparison. The model can be modified to include shielding of the convection electric field, and rotation in local time of the zero-energy dusk-side stagnation point. As an additional check of the model we will compare the electric field used in the model with the electric field as measured by the Van Allen Probes, as well as the validity of using a dipole magnetic field through comparison with the measured magnetic field.

  17. Teflon impregnated anatase TiO2 nanoparticles irradiated by 80 keV Xe+ ions

    NASA Astrophysics Data System (ADS)

    Khanam, Rizwin; Paul, Nibedita; Kumar, P.; Kanjilal, D.; Ahmed, Gazi A.; Mohanta, Dambarudhar

    2014-10-01

    We report the effect of 80 keV Xe+ ion irradiation on the morphological and optical responses of TiO2 nanoparticles spread over commercially available polytetrafluoroethylene (PTFE, Teflon). These nanoparticles were synthesized via a convenient, sol-gel approach with titanium isopropoxide as the main precursor. From X-ray diffraction (XRD) studies we found that, the nanoparticles crystallize in anatase phase and with a preferential orientation of crystallites along (1 0 1) plane. Upon irradiation at a fluence of 1.25 × 1017 ions/cm2, the nanoparticle dimension was found to increase from a value of ∼9 nm to ∼20-30 nm. Essentially, particle growth is predicted as a consequence of swelling behavior accompanied by the formation of Xe van der Waal crystals in isolated regions of nano-titania. Evidence of nanoripples was also witnessed on the surface of the irradiated nano-titania. The morphological evolution was assessed both by atomic force and transmission electron microscopies (AFM and TEM) independently. From the UV-Vis optical absorption studies, the estimated optical band gap was found to drop with increasing fluence, while refractive index exhibited a remarkable improvement. Photoluminescence (PL) studies have revealed that, the band edge emission and those due to the self trapped excitons (STE) and other oxygen vacancy related ones were manifested considerably as a result of Xe ion irradiation.

  18. Ion Beam Bombardment of Biological Tissue

    NASA Astrophysics Data System (ADS)

    Sangyuenyongpipat, S.; Yu, L. D.; Vilaithong, T.; Phanchaisri, B.; Anuntalabhochai, S.; Brown, I. G.

    2003-10-01

    While ion implantation has become a well-established technique for the surface modification of inorganic materials, the ion bombardment of cellular tissue has received little research attention. A program in ion beam bioengineering has been initiated at Chiang Mai University, and the ion beam induced transfer of plasmid DNA molecules into bacterial cells (E. coli) has been demonstrated. Subsequent work has been directed toward exploration of ion beam bombardment of plant cells in an effort to understand the possible mechanisms involved in the DNA transfer. In particular, ion beam bombardment of onion cells was carried out and the effects investigated. Among the novel features observed is the formation of "microcraters" - sub-micron surface features that could provide a pathway for the transfer of large molecules into the interior cell region. Here we describe our onion skin ion bombardment investigations.

  19. Micrometer-Scale Machining of Metals and Polymers Enabled by Focused Ion Beam Sputtering

    SciTech Connect

    Adams, D.P.; Benavides, G.L.; Vasile, M.J.

    1998-12-22

    This work combines focused ion beam sputtering and ultra-precision machining for microfabrication of metal alloys and polymers. Specifically, micro-end mills are made by Ga ion beam sputtering of a cylindrical tool shank. Using an ion energy of 20keV, the focused beam defines the tool cutting edges that have submicrometer radii of curvature. We demonstrate 25 {micro}m diameter micromilling tools having 2, 4 and 5 cutting edges. These tools fabricate fine channels, 26-28 microns wide, in 6061 aluminum, brass, and polymethyl methacrylate. Micro-tools are structurally robust and operate for more than 5 hours without fracture.

  20. Features of Fast Ion Instability of Partly Compensated Ion Beams

    NASA Astrophysics Data System (ADS)

    Dudnikov, Vadim

    2000-10-01

    Compensation of a space charge of particle beams by ions have some significant features very different of the electrons compensation. Heavier ions have longer lifetime in the beam and it is possible to reach overcompensation with transformation of repulse forces to the focusing. This feature help to the long distance beam transportation inside a small apertures. But, an ability of heavy ions to keep coherent motion can be a reason of strong coherent instabilities of particle beams with a space charge compensation by ions. A strong coherent focusing of ions in space charge potential of the beam during accumulation can create very high local density of compensating ions with a very picked distribution (Christmas tree distribution). "Fast ion instability" have been observed recently in some storage rings.Very fast development of transverse instability have been observed during a first production of high intense negative ion beam from surface-plasma sources. This instability was observed as oscillation of the local current density of negative ion beam with low fluctuation of beam intensity.

  1. TOPICAL REVIEW Dosimetry for ion beam radiotherapy

    NASA Astrophysics Data System (ADS)

    Karger, Christian P.; Jäkel, Oliver; Palmans, Hugo; Kanai, Tatsuaki

    2010-11-01

    Recently, ion beam radiotherapy (including protons as well as heavier ions) gained considerable interest. Although ion beam radiotherapy requires dose prescription in terms of iso-effective dose (referring to an iso-effective photon dose), absorbed dose is still required as an operative quantity to control beam delivery, to characterize the beam dosimetrically and to verify dose delivery. This paper reviews current methods and standards to determine absorbed dose to water in ion beam radiotherapy, including (i) the detectors used to measure absorbed dose, (ii) dosimetry under reference conditions and (iii) dosimetry under non-reference conditions. Due to the LET dependence of the response of films and solid-state detectors, dosimetric measurements are mostly based on ion chambers. While a primary standard for ion beam radiotherapy still remains to be established, ion chamber dosimetry under reference conditions is based on similar protocols as for photons and electrons although the involved uncertainty is larger than for photon beams. For non-reference conditions, dose measurements in tissue-equivalent materials may also be necessary. Regarding the atomic numbers of the composites of tissue-equivalent phantoms, special requirements have to be fulfilled for ion beams. Methods for calibrating the beam monitor depend on whether passive or active beam delivery techniques are used. QA measurements are comparable to conventional radiotherapy; however, dose verification is usually single field rather than treatment plan based. Dose verification for active beam delivery techniques requires the use of multi-channel dosimetry systems to check the compliance of measured and calculated dose for a representative sample of measurement points. Although methods for ion beam dosimetry have been established, there is still room for developments. This includes improvement of the dosimetric accuracy as well as development of more efficient measurement techniques.

  2. Focused ion beam source method and apparatus

    DOEpatents

    Pellin, Michael J.; Lykke, Keith R.; Lill, Thorsten B.

    2000-01-01

    A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud of laser ablated particles having unique characteristics, and extracting and focusing a charged particle beam from the laser ablated cloud. The method is especially suited for producing focused ion beams for semiconductor device analysis and modification.

  3. Focused Ion Beam Technology for Optoelectronic Devices

    NASA Astrophysics Data System (ADS)

    Reithmaier, J. P.; Bach, L.; Forchel, A.

    2003-08-01

    High-resolution proximity free lithography was developed using InP as anorganic resist for ion beam exposure. InP is very sensitive on ion beam irradiation and show a highly nonlinear dose dependence with a contrast function comparable to organic electron beam resists. In combination with implantation induced quantum well intermixing this new lithographic technique based on focused ion beams is used to realize high performance nano patterned optoelectronic devices like complex coupled distributed feedback (DFB) and distributed Bragg reflector (DBR) lasers.

  4. Nickel nanowires mesh fabricated by ion beam irradiation-induced nanoscale welding for transparent conducting electrodes

    NASA Astrophysics Data System (ADS)

    Honey, S.; Ahmad, I.; Madhuku, M.; Naseem, S.; Maaza, M.; Kennedy, J. V.

    2017-07-01

    In this report, random nickel nanowires (Ni-NWs) meshes are fabricated by ions beam irradiation-induced nanoscale welding of NWs on intersecting positions. Ni-NWs are exposed to beam of 50 KeV Argon (Ar+) ions at various fluencies in the range ~1015 ions cm-2 to 1016 ions cm-2 at room temperature. Ni-NWs are welded due to accumulation of Ar+ ions beam irradiation-induced sputtered atoms on crossing positions. Ar+ ions irradiated Ni-NWs meshes are optically transparent and optical transparency is enhanced with increase in beam fluence of Ar+ ions. Ar+ ions beam irradiation-induced welded and optically transparent mesh is then exposed to 2.75 MeV hydrogen (H+) ions at fluencies 1  ×  1015 ions cm-2, 3  ×  1015 ions cm-2 and 1  ×  1016 ions cm-2 at room temperature. MeV H+ ions irradiation-induced local heat cause melting and fusion of NWs on intersecting points and eventually lead to reduce contact resistance between Ni-NWs. Electrical conductivity is enhanced with increase in beam fluence of H+ ions. These welded highly transparent and electrically conductive Ni-NWs meshes can be employed as transparent conducting electrodes in optoelectronic devices.

  5. Beam emittance measurements on multicusp ion sources

    NASA Astrophysics Data System (ADS)

    Sarstedt, M.; Lee, Y.; Leung, K. N.; Perkins, L. T.; Pickard, D. S.; Weber, M.; Williams, M. D.

    1996-03-01

    Multicusp ion sources are used for various applications. Presently, the implementation of this type of ion source is planned for the development of an ion beam lithography machine, which will be used for the projection of sub-0.2 μm patterns onto a wafer substrate. Since, for this application, a very good beam quality and a small ion energy spread are required, emittance measurements have been performed on a multicusp ion source for various source conditions. It is shown that the installation of proper capacitors between the extraction electrodes is necessary to avoid rf pickup, which otherwise leads to a distortion of the beam emittance. The influence of the magnetic filter field on the beam emittance has been investigated, and the beam emittance of a dc filament-discharge plasma has also been compared to that of a rf-generated plasma.

  6. Radioactive ion beams of 111In using ECR plasma sputtering method

    NASA Astrophysics Data System (ADS)

    Naik, Vaishali; Bhattacharjee, Mahuwa; Kumar, D. Lavanya; Karmakar, Prasanta; Das, S. K.; Banerjee, Debashis; Chattopadhyay, Sankha; Barua, Luna; Das, Sujata Saha; Pal, Asit Kumar; Bandyopadhyay, Arup; Chakrabarti, Alok

    2017-06-01

    Radioactive ion beams of 111In (indium-111, half-life 2.8 days) have been produced using the plasma sputtering method in an electron cyclotron resonance (ECR) ion source at the Variable Energy Cyclotron Centre RIB facility. Indium isotopes were first produced by bombarding a natural silver target with a 32 MeV, 40 μ A alpha particle beam from the K-130 cyclotron. After radio-chemical separation, about 25 mCi In-chloride was deposited on an aluminum electrode and inserted in the plasma chamber of the ECR. Indium ions produced by ion induced sputtering in the plasma were extracted from the ion source, isotopically separated, and a pure 111In beam was measured at the focal plane of the separator. The measured 111In beam intensity was 2.67 × 105 particles/s for a beam energy of 5 keV.

  7. Radioactive ion beams of (111)In using ECR plasma sputtering method.

    PubMed

    Naik, Vaishali; Bhattacharjee, Mahuwa; Kumar, D Lavanya; Karmakar, Prasanta; Das, S K; Banerjee, Debashis; Chattopadhyay, Sankha; Barua, Luna; Das, Sujata Saha; Pal, Asit Kumar; Bandyopadhyay, Arup; Chakrabarti, Alok

    2017-06-01

    Radioactive ion beams of (111)In (indium-111, half-life 2.8 days) have been produced using the plasma sputtering method in an electron cyclotron resonance (ECR) ion source at the Variable Energy Cyclotron Centre RIB facility. Indium isotopes were first produced by bombarding a natural silver target with a 32 MeV, 40 μA alpha particle beam from the K-130 cyclotron. After radio-chemical separation, about 25 mCi In-chloride was deposited on an aluminum electrode and inserted in the plasma chamber of the ECR. Indium ions produced by ion induced sputtering in the plasma were extracted from the ion source, isotopically separated, and a pure (111)In beam was measured at the focal plane of the separator. The measured (111)In beam intensity was 2.67 × 10(5) particles/s for a beam energy of 5 keV.

  8. Beam-beam observations in the Relativistic Heavy Ion Collider

    SciTech Connect

    Luo, Y.; Fischer, W.; White, S.

    2015-06-24

    The Relativistic Heavy Ion Collider (RHIC) at Brookhaven National Laboratory has been operating since 2000. Over the past decade, thanks to the continuously increased bunch intensity and reduced β*s at the interaction points, the maximum peak luminosity in the polarized proton operation has been increased by more than two orders of magnitude. In this article, we first present the beam-beam observations in the previous RHIC polarized proton runs. Then we analyze the mechanisms for the beam loss and emittance growth in the presence of beam-beam interaction. The operational challenges and limitations imposed by beam-beam interaction and their remedies are also presented. In the end, we briefly introduce head-on beam-beam compensation with electron lenses in RHIC.

  9. Space charge compensation in the Linac4 low energy beam transport line with negative hydrogen ions.

    PubMed

    Valerio-Lizarraga, Cristhian A; Lallement, Jean-Baptiste; Leon-Monzon, Ildefonso; Lettry, Jacques; Midttun, Øystein; Scrivens, Richard

    2014-02-01

    The space charge effect of low energy, unbunched ion beams can be compensated by the trapping of ions or electrons into the beam potential. This has been studied for the 45 keV negative hydrogen ion beam in the CERN Linac4 Low Energy Beam Transport using the package IBSimu [T. Kalvas et al., Rev. Sci. Instrum. 81, 02B703 (2010)], which allows the space charge calculation of the particle trajectories. The results of the beam simulations will be compared to emittance measurements of an H(-) beam at the CERN Linac4 3 MeV test stand, where the injection of hydrogen gas directly into the beam transport region has been used to modify the space charge compensation degree.

  10. Space charge compensation in the Linac4 low energy beam transport line with negative hydrogen ions

    SciTech Connect

    Valerio-Lizarraga, Cristhian A.; Lallement, Jean-Baptiste; Lettry, Jacques; Scrivens, Richard; Leon-Monzon, Ildefonso; Midttun, Øystein

    2014-02-15

    The space charge effect of low energy, unbunched ion beams can be compensated by the trapping of ions or electrons into the beam potential. This has been studied for the 45 keV negative hydrogen ion beam in the CERN Linac4 Low Energy Beam Transport using the package IBSimu [T. Kalvas et al., Rev. Sci. Instrum. 81, 02B703 (2010)], which allows the space charge calculation of the particle trajectories. The results of the beam simulations will be compared to emittance measurements of an H{sup −} beam at the CERN Linac4 3 MeV test stand, where the injection of hydrogen gas directly into the beam transport region has been used to modify the space charge compensation degree.

  11. A comparative study on low-energy ion beam and neutralized beam modifications of naked DNA and biological effect on mutation

    NASA Astrophysics Data System (ADS)

    Sarapirom, S.; Thongkumkoon, P.; Prakrajang, K.; Anuntalabhochai, S.; Yu, L. D.

    2012-02-01

    DNA conformation change or damage induced by low-energy ion irradiation has been of great interest owing to research developments in ion beam biotechnology and ion beam application in biomedicine. Mechanisms involved in the induction of DNA damage may account for effect from implanting ion charge. In order to check this effect, we used both ion beam and neutralized beam at keV energy to bombard naked DNA. Argon or nitrogen ion beam was generated and extracted from a radiofrequency (RF) ion source and neutralized by microwave-driven plasma in the beam path. Plasmid DNA pGFP samples were irradiated with the ion or neutralized beam in vacuum, followed by gel electrophoresis to observe changes in the DNA conformations. It was revealed that the ion charge played a certain role in inducing DNA conformation change. The subsequent DNA transfer into bacteria Escherichia coli ( E. coli) for mutation analysis indicated that the charged ion beam induced DNA change had high potential in mutation induction while neutralized beam did not. The intrinsic reason was attributed to additional DNA deformation and contortion caused by ion charge exchange effect so that the ion beam induced DNA damage could hardly be completely repaired, whereas the neutralized beam induced DNA change could be more easily recoverable owing to absence of the additional DNA deformation and contortion.

  12. Institut d'Astrophysique Spatiale (IAS) 0.1- to 15-keV Synchrotron Radiation Facility beam lines

    NASA Astrophysics Data System (ADS)

    Dhez, Pierre; Jourdain, Erick; Hainaut, Olivier; Hochedez, Jean-Francois E.; Labeque, Alain; Salvetat, Philippe; Song, Xue Yan

    1997-10-01

    Two beam lines have been built at the Institute d'Astrophysique Spatiale (IAS) d'Orsay to perform absolute calibration of the EPIC (European photon imaging camera). EPIC consists of three x-ray charge coupled device (CCD) cameras having imaging and spectroscopic performances set at the Wolter telescope focal planes on board the x-ray multi mirror mission (XMM) planned to be launched by ESA in August 1999. To cover the desired 0.1 - 15 keV range a dedicated beam line has been built on each synchrotron sources of the Laboratoire pour l'Utilisation du Rayonnement Synchrotron (LURE): SACO (0.8 GeV) and DCI (1.5 GeV). Both beam lines are merging in a clean 23 m(superscript 3) vacuum tank containing the camera to calibrate. (1) The SACO windowless beam line is equipped with a grating monochromator. Four plane VLS gratings are used to cover the low energy range (0.1 - 1.2 keV). A triple grazing incidence mirror system set in front of the entrance slit removes the overlapping orders. (2) The high energy beam line on DCI has a 50 micrometer beryllium window and a double flat crystals monochromator equipped with four different crystal pairs. A double grazing incidence mirror system set close to the source absorbs the high energy photon spectra. CCD calibrations will be performed during 1997 second semester and years 1998.

  13. Ion beam microtexturing and enhanced surface diffusion

    NASA Technical Reports Server (NTRS)

    Robinson, R. S.

    1982-01-01

    Ion beam interactions with solid surfaces are discussed with particular emphasis on microtexturing induced by the deliberate deposition of controllable amounts of an impurity material onto a solid surface while simultaneously sputtering the surface with an ion beam. Experimental study of the optical properties of microtextured surfaces is described. Measurements of both absorptance as a function of wavelength and emissivity are presented. A computer code is described that models the sputtering and ion reflection processes involved in microtexture formation.

  14. Beam ion confinement on NSTX-U

    NASA Astrophysics Data System (ADS)

    Liu, D.; Heidbrink, W. W.; Hao, G. Z.; Podesta, M.; Darrow, D. S.; Fredrickson, E. D.

    2016-10-01

    A second and more tangential neutral beam line is a major upgrade component of the National Spherical Torus Experiment - Upgrade (NSTX-U) with the purpose of improving neutral beam current drive efficiency and providing more flexibility in current/pressure profile control. Good beam ion confinement is essential to achieve the anticipated improvements in performance. In the planned beam ion confinement experiment, various short and long (relative to fast ion slowing-down time) neutral beam (NB) pulses from six neutral beam sources will be injected into center-stack limited L-mode plasmas to characterize the beam ion confinement and distribution function produced by the new and the existing NBI lines. The neutron rate decay after the turn-off of short NB pulses will be used to estimate the beam ion confinement time and to investigate its dependence on NB source/geometry, injection energy, and plasma current. The tangential and vertical Fast-Ion D-Alpha (FIDA) diagnostics and multi-view Solid State Neutral Particle Analyzer (SSNPA) arrays will be used to measure beam ion slowing-down distribution function and spatial profile during the injection of relatively long NB pulses. Beam ion prompt losses will be monitored with a scintillator Fast Lost Ion Probe (sFLIP) diagnostic. The experimental data and comparisons with classical predictions from NUBEAM modeling will be presented. Work supported by U.S. DOE DE-AC0209CH11466, DE-FG02-06ER54867, and DE-FG03-02ER54681.

  15. Ion-beam assisted, electron-beam physical vapor deposition

    SciTech Connect

    Singh, J.

    1996-12-01

    Electron beam-physical vapor deposition (EB-PVD) is a relatively new technology that has overcome some of the difficulties associated with chemical vapor deposition, physical vapor deposition, and thermal spray processes. In the EB-PVD process, focused high-energy electron beams generated from electron guns are directed to melt and evaporate ingots, as well as preheat the substrate inside a vacuum chamber. By adding the assistance of ion beams to the process, coating density and adhesion are improved, while costs are reduced. This article describes physical vapor deposition and ion-beam processes, explains the advantages of EB-PVD, shows how ion beams optimize the benefits of EB-PVD, and enumerates a variety of applications.

  16. Atomic layer deposition ultrathin film origami using focused ion beams

    NASA Astrophysics Data System (ADS)

    Supekar, O. D.; Brown, J. J.; Eigenfeld, N. T.; Gertsch, J. C.; Bright, V. M.

    2016-12-01

    Focused ion beam (FIB) micromachining is a powerful tool for maskless lithography and in recent years FIB has been explored as a tool for strain engineering. Ion beam induced deformation can be utilized as a means for folding freestanding thin films into complex 3D structures. FIB of high energy gallium (Ga+) ions induces stress by generation of dislocations and ion implantation within material layers, which create creases or folds upon mechanical relaxation enabled by motion of the material layers. One limitation on such processing is the ability to fabricate flat freestanding thin film structures. This capability is limited by the residual stresses formed during processing and fabrication of the films, which can result in initial curvature and deformation of films upon release from a sacrificial fabrication layer. This paper demonstrates folding in freestanding ultrathin films (<40 nm thin) of heterogeneous composition (metal, insulator, semiconductor, etc) with large lateral dimension structures (aspect ratio >1:1000) by ion-induced stress relaxation. The ultrathin flat structures are fabricated using atomic layer deposition on sacrificial polyimide. We have demonstrated vertical folding with 30 keV Ga+ ions in structures with lateral dimensions varying from 10 to 50 μm.

  17. Atomic layer deposition ultrathin film origami using focused ion beams.

    PubMed

    Supekar, O D; Brown, J J; Eigenfeld, N T; Gertsch, J C; Bright, V M

    2016-12-09

    Focused ion beam (FIB) micromachining is a powerful tool for maskless lithography and in recent years FIB has been explored as a tool for strain engineering. Ion beam induced deformation can be utilized as a means for folding freestanding thin films into complex 3D structures. FIB of high energy gallium (Ga(+)) ions induces stress by generation of dislocations and ion implantation within material layers, which create creases or folds upon mechanical relaxation enabled by motion of the material layers. One limitation on such processing is the ability to fabricate flat freestanding thin film structures. This capability is limited by the residual stresses formed during processing and fabrication of the films, which can result in initial curvature and deformation of films upon release from a sacrificial fabrication layer. This paper demonstrates folding in freestanding ultrathin films (<40 nm thin) of heterogeneous composition (metal, insulator, semiconductor, etc) with large lateral dimension structures (aspect ratio >1:1000) by ion-induced stress relaxation. The ultrathin flat structures are fabricated using atomic layer deposition on sacrificial polyimide. We have demonstrated vertical folding with 30 keV Ga(+) ions in structures with lateral dimensions varying from 10 to 50 μm.

  18. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, Joshua (Inventor); Hubbell, Theodore E. (Inventor)

    1987-01-01

    A surface of a steel substrate is nitrided without external heating by exposing it to a beam of nitrogen ions under low pressure, a pressure much lower than that employed for ion-nitriding. An ion source is used instead of a glow discharge. Both of these features reduce the introduction of impurities into the substrate surface.

  19. First test of BNL electron beam ion source with high current density electron beam

    NASA Astrophysics Data System (ADS)

    Pikin, Alexander; Alessi, James G.; Beebe, Edward N.; Shornikov, Andrey; Mertzig, Robert; Wenander, Fredrik; Scrivens, Richard

    2015-01-01

    A new electron gun with electrostatic compression has been installed at the Electron Beam Ion Source (EBIS) Test Stand at BNL. This is a collaborative effort by BNL and CERN teams with a common goal to study an EBIS with electron beam current up to 10 A, current density up to 10,000 A/cm2 and energy more than 50 keV. Intensive and pure beams of heavy highly charged ions with mass-to-charge ratio < 4.5 are requested by many heavy ion research facilities including NASA Space Radiation Laboratory (NSRL) at BNL and HIE-ISOLDE at CERN. With a multiampere electron gun, the EBIS should be capable of delivering highly charged ions for both RHIC facility applications at BNL and for ISOLDE experiments at CERN. Details of the electron gun simulations and design, and the Test EBIS electrostatic and magnetostatic structures with the new electron gun are presented. The experimental results of the electron beam transmission are given.

  20. First test of BNL electron beam ion source with high current density electron beam

    SciTech Connect

    Pikin, Alexander Alessi, James G. Beebe, Edward N.; Shornikov, Andrey; Mertzig, Robert; Wenander, Fredrik; Scrivens, Richard

    2015-01-09

    A new electron gun with electrostatic compression has been installed at the Electron Beam Ion Source (EBIS) Test Stand at BNL. This is a collaborative effort by BNL and CERN teams with a common goal to study an EBIS with electron beam current up to 10 A, current density up to 10,000 A/cm{sup 2} and energy more than 50 keV. Intensive and pure beams of heavy highly charged ions with mass-to-charge ratio < 4.5 are requested by many heavy ion research facilities including NASA Space Radiation Laboratory (NSRL) at BNL and HIE-ISOLDE at CERN. With a multiampere electron gun, the EBIS should be capable of delivering highly charged ions for both RHIC facility applications at BNL and for ISOLDE experiments at CERN. Details of the electron gun simulations and design, and the Test EBIS electrostatic and magnetostatic structures with the new electron gun are presented. The experimental results of the electron beam transmission are given.

  1. The formation of nanopores in metal materials after irradiation by beams of Ar+ with energy of 30 keV

    NASA Astrophysics Data System (ADS)

    Ivchenko, V. A.

    2017-01-01

    In this paper are the results of direction observations of nanopores in the subsurface volume of metals materials Pt and Pd(CuAg) using field-ion microscopy (FIM). Radiation of tip specimens was carried out with ions having an energy ˜ 25-30 keV in the fluency range of 1016 - 1018 ions/cm2, the current density lying within 150- 340 µA/cm2. Nanopores have been observed immediately after removal of the first atomic layers from the irradiated surface. It was established that, the threshold for ion-implanted platinum corresponds to fluence F = 1017 ions/cm2. For Pd(CuAg) it was revealed that nanopores have been down to 80 nm deep with current density 340 µA/cm2. Their dimensions and volume fractions were determined. The obtained results can be used for prediction of radiation stability of materials based on fcc metals.

  2. Intense non-relativistic cesium ion beam

    SciTech Connect

    Lampel, M.C.

    1984-02-01

    The Heavy Ion Fusion group at Lawrence Berkeley Laboratory has constructed the One Ampere Cesium Injector as a proof of principle source to supply an induction linac with a high charge density and high brightness ion beam. This is studied here. An electron beam probe was developed as the major diagnostic tool for characterizing ion beam space charge. Electron beam probe data inversion is accomplished with the EBEAM code and a parametrically adjusted model radial charge distribution. The longitudinal charge distribution was not derived, although it is possible to do so. The radial charge distribution that is derived reveals an unexpected halo of trapped electrons surrounding the ion beam. A charge fluid theory of the effect of finite electron temperature on the focusing of neutralized ion beams (Nucl. Fus. 21, 529 (1981)) is applied to the problem of the Cesium beam final focus at the end of the injector. It is shown that the theory's predictions and assumptions are consistent with the experimental data, and that it accounts for the observed ion beam radius of approx. 5 cm, and the electron halo, including the determination of an electron Debye length of approx. 10 cm.

  3. Laser ion source for low charge heavy ion beams

    SciTech Connect

    Okamura,M.; Pikin, A.; Zajic, V.; Kanesue, T.; Tamura, J.

    2008-08-03

    For heavy ion inertial fusion application, a combination of a laser ion source and direct plasma injection scheme into an RFQ is proposed. The combination might provide more than 100 mA of singly charged heavy ion beam from a single laser shot. A planned feasibility test with moderate current is also discussed.

  4. O+ ion beams reflected below the Martian bow shock: MAVEN observations

    NASA Astrophysics Data System (ADS)

    Masunaga, K.; Seki, K.; Brain, D. A.; Fang, X.; Dong, Y.; Jakosky, B. M.; McFadden, J. P.; Halekas, J. S.; Connerney, J. E. P.

    2016-04-01

    We investigate a generation mechanism of O+ ion beams observed above the Martian bow shock by analyzing ion velocity distribution functions (VDFs) measured by the Suprathermal and Thermal Ion Composition instrument on the Mars Atmosphere and Volatile Evolution (MAVEN) spacecraft. In the solar wind near Mars, MAVEN often observes energetic O+ ion beams (~10 keV or higher). Accompanied with the O+ ion beam events, we sometimes observe characteristic ion VDFs in the magnetosheath: a partial ring distribution. The partial ring distribution corresponds to pickup ions with a finite initial velocity (i.e., not newborn pickup ions), and its phase space density is much smaller than that of local pickup O+ ions of the magnetosheath. Thus, the partial ring distribution is most likely produced by the reflection of pickup O+ ions precipitating from the upstream solar wind below the bow shock. After being injected into the magnetosheath from the solar wind, the precipitating O+ ions are subject to the significantly enhanced magnetic field in this region and start to gyrate around the guiding center of the plasma frame in the magnetosheath. Consequently, a part of precipitating O+ ions are reflected back to the solar wind, generating O+ beams in the solar wind. The beams direct quasi-sunward near the subsolar region but have large angle with respect to the sunward direction at high solar zenith angles (>50°). The reflected O+ beams are accelerated by the convection electric field of the solar wind and may escape Mars.

  5. Beam ion instability: Measurement, analysis, and simulation

    SciTech Connect

    Wang, L.; Safranek, J.; Cai, Y.; Corbett, J.; Hettel, B.; Raubenheimer, T. O.; Schmerge, J.; Sebek, J.; /SLAC

    2013-10-03

    A weak vertical coupled-bunch instability with oscillation amplitude of the order of a few μ m has been observed in SPEAR3 at nominal vacuum pressure. The instability becomes stronger with increasing neutral gas pressure as observed by turning off vacuum pumps, and becomes weaker when the vertical beam emittance is increased. These observations indicate that the vertical beam motion is driven by ions trapped in the periodic potential of the electron beam. In this paper we present a series of comprehensive beam measurements, impedance-based stability analysis, and numerical simulations of beam-ion interactions in SPEAR3. The effects of vacuum pressure, gas species, beam current, bunch fill pattern, chromaticity, and vertical beam emittance are investigated.

  6. Summary of the status of negative-ion-based neutral beams

    SciTech Connect

    Cooper, W.S.

    1983-01-01

    Negative-ion-based neutral beam systems can perform multiple functions for fusion reactors, such as heating, current drive in tokamak reactors, and establishing and maintaining potential barriers in tandem mirror reactors. Practical systems operating continuously at the 200 keV, 1 MW level can be built using present-day technology. Ion sources have been demonstrated that produce D/sup -/ beams with <5% electron content, and that operate at linear current densities that are within a factor of 2 of what conservatively designed accelerator/transport structures can handle. Concepts are in hand for transporting the negative ion beam through a neutron maze before neutralization, thus permitting a radiation-hardened beamline. With an advanced laser photoneutralizer, overall system power efficiencies of 70% should be possible. A national program is being planned to achieve the goal of application of 475 keV systems on a mirror ETR in 1994.

  7. Confined ion beam sputtering device and method

    DOEpatents

    Sharp, Donald J.

    1988-01-01

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  8. Confined ion beam sputtering device and method

    DOEpatents

    Sharp, D.J.

    1986-03-25

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  9. A new concept of pencil beam dose calculation for 40-200 keV photons using analytical dose kernels.

    PubMed

    Bartzsch, Stefan; Oelfke, Uwe

    2013-11-01

    The advent of widespread kV-cone beam computer tomography in image guided radiation therapy and special therapeutic application of keV photons, e.g., in microbeam radiation therapy (MRT) require accurate and fast dose calculations for photon beams with energies between 40 and 200 keV. Multiple photon scattering originating from Compton scattering and the strong dependence of the photoelectric cross section on the atomic number of the interacting tissue render these dose calculations by far more challenging than the ones established for corresponding MeV beams. That is why so far developed analytical models of kV photon dose calculations fail to provide the required accuracy and one has to rely on time consuming Monte Carlo simulation techniques. In this paper, the authors introduce a novel analytical approach for kV photon dose calculations with an accuracy that is almost comparable to the one of Monte Carlo simulations. First, analytical point dose and pencil beam kernels are derived for homogeneous media and compared to Monte Carlo simulations performed with the Geant4 toolkit. The dose contributions are systematically separated into contributions from the relevant orders of multiple photon scattering. Moreover, approximate scaling laws for the extension of the algorithm to inhomogeneous media are derived. The comparison of the analytically derived dose kernels in water showed an excellent agreement with the Monte Carlo method. Calculated values deviate less than 5% from Monte Carlo derived dose values, for doses above 1% of the maximum dose. The analytical structure of the kernels allows adaption to arbitrary materials and photon spectra in the given energy range of 40-200 keV. The presented analytical methods can be employed in a fast treatment planning system for MRT. In convolution based algorithms dose calculation times can be reduced to a few minutes.

  10. Ion Beam Measurements of a Dense Plasma Focus Device Using CR 39 Nuclear Track Detectors

    NASA Astrophysics Data System (ADS)

    Ngoi, S. K.; Yap, S. L.; Wong, C. S.; Saadah, A. R.

    2008-05-01

    The project is carried out using a small Mather type plasma focus device powered by a 15 kV, 30 μF capacitor. The filling gas used is argon. The ion beam generated is investigated by both time resolved and time integrated methods. Investigation on the dynamic of the current sheath is also carried out in order to obtain an optimum condition for ion beam production. The angular distribution of the ion emission is measured at positions of 0° (end-on), 45° and 90° (side-on) by using CR-39 nuclear track detectors. The divergence of the ion beam is also determined using these detectors. A biased ion collector is used for time resolved measurement of the ion beam. Time of flight technique is employed for the determination of the ion beam energy. Average ion beam energy obtained is about 180 keV. The ion beam produced can be used for applications such as material surface modification and ion implantation.

  11. Evolution of tungsten film deposition induced by focused ion beam

    NASA Astrophysics Data System (ADS)

    Langfischer, H.; Basnar, B.; Hutter, H.; Bertagnolli, E.

    2002-07-01

    Direct write metallization is an important approach for circuit modification and prototyping. We investigate the evolution of the chemical vapor deposition of tungsten induced by a 50 keV focused Ga+ ion beam. Time resolved imaging in combination with atomic force microscopy reveals that chemical vapor deposition of tungsten by focused ion beam proceeds via two clearly distinguishable regimes of layer growth. Deposition starts with the nucleation of nanoscale tungsten deposits scattered over the substrate surface. Despite local impacts of the ion beam within the irradiated area of the substrate the localization of the nucleation spots is not correlated to the scan path of the ion beam. The nanoscale tungsten particles preserve their position and typical shape during further deposition. Only after merging of the particles into a contiguous tungsten layer, does the second regime of growth characterized by deposition of tungsten on a tungsten surface set in. In this regime the deposition process is determined by the total ion dose and the average current density the sample was subjected to. Deposition yields up to 3.5 atoms per incident gallium ion are achieved. The layer quality is determined by Auger electron analysis, which shows fractions of Ga, C, Si and O in the W layer. Depth profiling by secondary ion mass spectroscopy showed the depth profiles of these constituents and confirmed the existence of a 50-100 nm thick transition zone between the tungsten layer and the substrate. Electrical resistivity of metal layers of 250 mu Omega cm and current densities up to 3.5 x106 A/cm2 are measured by means of van der Pauw test structures. In order to give a concise description of the experimental findings the data were interpreted utilizing an analytic model that mainly incorporates the precursor gas coverage, precursor gas transformation cross section and ion induced sputtering. The critical ion current density, where ion sputtering exceeds the deposition, was

  12. Multicusp sources for ion beam projection lithography

    NASA Astrophysics Data System (ADS)

    Lee, Y.; Gough, R. A.; Kunkel, W. B.; Leung, K. N.; Vujic, J.; Williams, M. D.; Wutte, D.; Zahir, N.

    1998-02-01

    Multicusp ion sources are capable of producing positive and negative ions with good beam quality and low energy spread. The ion energy spread of multicusp sources has been measured by three different techniques. The axial ion energy spread has been reduced by introducing a magnetic filter inside the multicusp source chamber which adjusts the plasma potential distribution. The axial energy spread is further reduced by optimizing the source configuration. Values as low as 0.8 eV have been achieved.

  13. Hardness enhancement and crosslinking mechanisms in polystyrene irradiated with high energy ion-beams

    SciTech Connect

    Lee, E.H.; Rao, G.R.; Mansur, L.K.

    1996-12-31

    Surface hardness values several times larger than steel were produced using high energy ion beams at several hundred keV to MeV. High LET is important for crosslinking. Crosslinking is studied by analyzing hardness variations in response to irradiation parameter such as ion species, energy, and fluence. Effective crosslinking radii at hardness saturation are derived base on experimental data for 350 keV H{sup +} and 1 MeV Ar{sup +} irradiation of polystyrene. Saturation value for surface hardness is about 20 GPa.

  14. Evaluation of Surface Damage of Organic Films due to Irradiation with Energetic Ion Beams

    SciTech Connect

    Hada, Masaki; Hontani, Yusaku; Ichiki, Kazuya; Seki, Toshio; Ibuki, Sachi; Ninomiya, Satoshi; Matsuo, Jiro; Aoki, Takaaki

    2011-01-07

    The surface of L-leucine films irradiated with an Ar{sub 5000} cluster ion beam (5 keV) was characterized by using the X-ray reflective (XRR) measurement method, atomic force microscopy (AFM) and ellipsometry. No significant damage was detected on the surface of the L-leucine films irradiated with the Ar cluster ion beam. Therefore, the large cluster-low-energy (about 1 eV/atom) beam would be suitable for low-damage etching of organic materials.

  15. Potential biomedical applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Van Kampen, C. L.; Babbush, C. A.

    1976-01-01

    Electron bombardment ion thrusters used as ion sources have demonstrated a unique capability to vary the surface morphology of surgical implant materials. The microscopically rough surface texture produced by ion beam sputtering of these materials may result in improvements in the biological response and/or performance of implanted devices. Control of surface roughness may result in improved attachment of the implant to soft tissue, hard tissue, bone cement, or components deposited from blood. Potential biomedical applications of ion beam texturing discussed include: vascular prostheses, artificial heart pump diaphragms, pacemaker fixation, percutaneous connectors, orthopedic prosthesis fixation, and dental implants.

  16. Potential biomedical applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Babbush, C. A.; Vankampen, C. L.

    1976-01-01

    Electron bombardment ion thrusters used as ion sources have demonstrated a unique capability to vary the surface morphology of surgical implant materials. The microscopically rough surface texture produced by ion beam sputtering of these materials may result in improvements in the biological response and/or performance of implanted devices. Control of surface roughness may result in improved attachment of the implant to soft tissue, hard tissue, bone cement, or components deposited from blood. Potential biomedical applications of ion beam texturing discussed include: vascular prostheses, artificial heart pump diaphragms, pacemaker fixation, percutaneous connectors, orthopedic pros-thesis fixtion, and dental implants.

  17. Potential biomedical applications of ion beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Van Kampen, C. L.; Babbush, C. A.

    1976-01-01

    Electron bombardment ion thrusters used as ion sources have demonstrated a unique capability to vary the surface morphology of surgical implant materials. The microscopically rough surface texture produced by ion beam sputtering of these materials may result in improvements in the biological response and/or performance of implanted devices. Control of surface roughness may result in improved attachment of the implant to soft tissue, hard tissue, bone cement, or components deposited from blood. Potential biomedical applications of ion beam texturing discussed include: vascular prostheses, artificial heart pump diaphragms, pacemaker fixation, percutaneous connectors, orthopedic prosthesis fixation, and dental implants.

  18. Ion-beam technology and applications

    NASA Technical Reports Server (NTRS)

    Hudson, W. R.; Robson, R. R.; Sovey, J. S.

    1977-01-01

    Ion propulsion research and development yields a mature technology that is transferable to a wide range of nonpropulsive applications, including terrestrial and space manufacturing. A xenon ion source was used for an investigation into potential ion-beam applications. The results of cathode tests and discharge-chamber experiments are presented. A series of experiments encompassing a wide range of potential applications is discussed. Two types of processes, sputter deposition, and erosion were studied. Some of the potential applications are thin-film Teflon capacitor fabrication, lubrication applications, ion-beam cleaning and polishing, and surface texturing.

  19. Ion beam generated modes in the lower hybrid frequency range in a laboratory magnetoplasma

    NASA Astrophysics Data System (ADS)

    van Compernolle, Bart; Tripathi, Shreekrishna Kp; Gekelman, Walter; Pribyl, Patrick; Colestock, Patrick

    2012-10-01

    The interaction of a fast ion beam with a low β plasma has been studied in the laboratory. Experiments were performed at the LArge Plasma Device (LAPD) at UCLA. The experiments were done in a Helium plasma (n ˜10^12 cm-3, B0 = 1000 G - 1800 G, fpe/fce˜1 - 5, Te= 0.25 eV, vtevA). The ion beam is a Helium beam with energies ranging from 5 keV to 18 keV. The fast ion velocity is on the order of the Alfv'en velocity. The beam is injected from the end of the machine, and spirals down the linear device. Waves were observed below fci in the shear Alfv'en wave regime, and in a broad spectrum above fci in the lower hybrid frequency range, the focus of this paper. The wave spectra have distinct peaks close to ion cyclotron harmonics, extending out to the 100th harmonic in some cases. The wave generation was studied for various plasma parameters, as well as for different beam energies and pitch angles. The waves were measured with 3-axis electric and magnetic probes. Detailed measurements of the perpendicular mode structure will be shown. Langmuir probes were used to measure density and temperature evolution due to the beam-plasma interaction. Retarding field energy analyzers captured the ion beam profiles.

  20. Ion Beam Scattering by Background Helium

    NASA Astrophysics Data System (ADS)

    Grillet, Anne; Hughes, Thomas; Boerner, Jeremiah

    2015-11-01

    The presence of background gases can cause charged particle beams to become more diffuse due to scattering. Calculations for the transport of an ion beam have been performed using Aleph, a particle-in-cell plasma modeling code, and verified against a general envelop equation for charged particle beams. We have investigated the influence of background helium on the coherence and transmitted current of the ion beam. Collisions between ions and neutral particles were calculated assuming isotropic elastic scattering. Since this tends to predict larger scattering angles than are expected at high energies, these are conservative estimates for beam scattering. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration.

  1. Focused Ion Beam Fabrication of Microelectronic Structures

    DTIC Science & Technology

    1990-12-01

    writ- (5400 A thick, - 50 at. % Au), pumping out the organome- ing across preevaporated metal (Au, W, AL, and NiCr ) con- tallic gas and then sputtering ...surface interaction is multifaceted. Energetic ions (the relevant range in this field has been 1-300 keV) incident on a surface will: a) sputter off...main commercial applications of these columns, namely, photomask repair and integrated circuit restructuring, diagnostics and repair, exploit sputtering

  2. Biomedical applications of ion-beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Gibbons, D. F.; Vankampen, C. L.; Babbush, C. A.

    1979-01-01

    Microscopically-rough surface texture of various biocompatible alloys and polymers produced by ion-beam sputtering may result in improvements in response of hard or soft tissue to various surgical implants.

  3. Tuning ferromagnetism by varying ion beam profiles

    NASA Astrophysics Data System (ADS)

    Hariwal, Rajesh V.; Malik, Hitendra K.; Asokan, K.

    2017-02-01

    Present study demonstrates a novel technique to tune the ferromagnetism at room temperature by varying the ion beam profiles from 3 to 7 mm during Carbon ion implantation in ZnO matrix and keeping other beam parameters constant. The interaction of implanted C ions with host ZnO matrix at different profiles result in variable ferromagnetism from 0.75 to 3.0  ×  10‑4 emu gm‑1 due to difference in the induced radiation pressure. Similar variation is also observed in the optical bandgap from 3.35 to 3.24 eV for different beam profiles. This study shows that the material properties can be tuned and controlled by the variation of beam profiles during the ion implantation.

  4. Biomedical applications of ion-beam technology

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Gibbons, D. F.; Vankampen, C. L.; Babbush, C. A.

    1979-01-01

    Microscopically-rough surface texture of various biocompatible alloys and polymers produced by ion-beam sputtering may result in improvements in response of hard or soft tissue to various surgical implants.

  5. The study of X-ray M-shell spectra of W ions from the LLNL Electron Beam Ion Trap

    SciTech Connect

    Neill, P; Harris, C; Shlyaptseva, A S; Hamasha, S; Hansen, S; Beiersdorfer, P; Safronova, U I

    2003-11-24

    M-shell spectra of W ions have been produced at the Livermore EBIT-II electron beam ion trap at different energies of the electron beam. A survey has been performed for 2.4 keV, 2.8 keV, 3.6 keV and for steps in energy of 100 eV over the 3.9-4.6 keV energy range. The analysis of 11 W spectra has shown the presence of a wide variety of ionization stages from Se-like to Cr-like W; the appearances of these ionization stages correlate well with the energy of their production. The present paper focuses on the identification of 63 experimental features of W ions in a spectral region from 5 to 6 Angstrom using calculations with inclusion of all ionization stages matching this spectral region. The majority of lines in all spectra have been identified and assigned to the 4f {yields} 3d and 4d {yields} 3p transitions. This is the first work that lists a comprehensive identification of so many resolved spectral features of M-shell transitions in W ions recorded in such detail in the laboratory.

  6. Ion beam mixing of Fe with sapphire and silica

    SciTech Connect

    Sinha, S. K.; Vigen, K. M.; Kothari, D. C.; Som, T.; Kulkarni, V. N.; Nair, K. G. M.

    1999-06-10

    We have studied ion beam mixing of Fe with sapphire, silica, Al and Si using different mass of the ions (Ne{sup +},Ar{sup +}), different doses (5x10{sup 15} to 2x10{sup 17} ions/cm{sup 2}) and different temperatures (273 deg. K, 423 deg. K and 573 deg. K). Thin film of Fe was deposited by thermal evaporation method. Ion energy was chosen from 30 to 110 keV so that F{sub d} is maximum at the interface. All the specimens were analyzed by RBS. It is found that the square of the diffusion length Dt is proportional to the ion dose for both types of the substrates (Al{sub 2}O{sub 3} and SiO{sub 2}) implying that mixing is due to the ballistic effect (i.e. cascade mixing). Also mixing is more when irradiated by Ar{sup +} ions than Ne{sup +} ions. Comparison of Dt's shows that mixing is less in ceramics than in pure-elements Al and Si. In Fe-Al{sub 2}O{sub 3} samples, mixing decreases with increase in irradiation temperatures implying de-mixing in crystalline ionic bonded oxide whereas mixing increases in the covalently bonded oxide SiO{sub 2}. Irradiated annealed samples of Fe/Al{sub 2}O{sub 3} and Fe/SiO{sub 2} show de-mixing and mixing respectively.

  7. TXRF spectrometry at ion beam excitation

    NASA Astrophysics Data System (ADS)

    Egorov, V.; Egorov, E.; Afanas’ef, M.

    2017-02-01

    The work presents short discussion of TXRF and PIXE methods peculiarities. Taking into account of these peculiarities we elaborate the experimental scheme for TXRF measurements at ion beam excitation of characteristical fluorescence. The scheme is built on base of the planar X-ray waveguide-resonator with specific design. Features of the new experimental method and possibilities of Sokol-3 ion beam analytical complex were used for the method application in real measurements.

  8. Radioactive-ion-beam research at Livermore

    NASA Astrophysics Data System (ADS)

    Haight, R. C.; Mathews, G. J.; Ward, R. A.; Woosley, S. E.

    1983-06-01

    The ability to produce secondary radioactive heavy ion beams which can be isolated, focused, and transported to a secondary target can enable reaction studies and other research with the approximately more than 1300 nuclei with decay lifetimes approximately more than 1 microsec. Current research in secondary beam production and future applications in astrophysics, nuclear structure, heavy ion physics, and radiotherapy are examined as well as associated spin off and technology transfer in applied physics.

  9. Ion beam processing of advanced electronic materials

    SciTech Connect

    Cheung, N.W.; Marwick, A.D.; Roberto, J.B.; International Business Machines Corp., Yorktown Heights, NY . Thomas J. Watson Research Center; Oak Ridge National Lab., TN )

    1989-01-01

    This report contains research programs discussed at the materials research society symposia on ion beam processing of advanced electronic materials. Major topics include: shallow implantation and solid-phase epitaxy; damage effects; focused ion beams; MeV implantation; high-dose implantation; implantation in III-V materials and multilayers; and implantation in electronic materials. Individual projects are processed separately for the data bases. (CBS)

  10. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, J.

    1984-01-01

    The application of the ion beam technique to the nitriding of steels is described. It is indicated that the technique can be successfully applied to nitriding. Some of the structural changes obtained by this technique are similar to those obtained by ion nitriding. The main difference is the absence of the iron nitride diffraction lines. It is found that the dependence of the resultant microhardness on beam voltage for super nitralloy is different from that of 304 stainless steel.

  11. Ion-beam nitriding of steels

    NASA Technical Reports Server (NTRS)

    Salik, J.

    1985-01-01

    The application of the ion beam technique to the nitriding of steels is described. It is indicated that the technique can be successfully applied to nitriding. Some of the structural changes obtained by this technique are similar to those obtained by ion nitriding. The main difference is the absence of the iron nitride diffraction lines. It is found that the dependence of the resultant microhardness on beam voltage for super nitralloy is different from that of 304 stainless steel.

  12. Nuclear data for ion beam analysis applications

    NASA Astrophysics Data System (ADS)

    Dimitriou, Paraskevi; Semkova, Valentina; Zerkin, Viktor

    2017-09-01

    Nuclear data for Ion Beam Analysis have been compiled and disseminated by the Nuclear Data Section through the Ion Beam Analysis Nuclear Data Library (IBANDL) for over a decade. Recent efforts to enrich IBANDL with gamma-ray producing nuclear reaction cross sections, and to improve search and retrieval features are presented. The coordinated effort to produce reliable evaluated cross-section data for charged-particle reactions for a wider range of applications is also discussed.

  13. Energy dependent ripple growth on Si (100) by N+ ion beam irradiation

    NASA Astrophysics Data System (ADS)

    Bhowmik, D.; Karmakar, P.

    2017-05-01

    The energy dependence of pattern formation on Si (100) surface by N+ ion beam irradiation has been studied. Periodic ripple pattern growth has been found for low energy (5-10 keV) N+ ion bombardment at oblique incidence at a fluence of 7 × 1017 ions/cm2. The wave vector of the ripples is parallel to the ion beam direction which follows the Bradley Harper theory of ripple growth [Bradley et. al, J. Vac. Sci. Technol. A 6, 2390 (1988)]. We also found that the lateral (wavelength) and vertical (roughness) dimensions of the ripples increase with the ion energy. Ion penetration and collision cascade dimensions are calculated by Stopping and Range of Ions in Matter (SRIM). It is found that the roughness is proportional to ion penetration depth whereas the wavelength is proportional to the horizontal width of collision cascade.

  14. Energy loss of keV fluorine ions scattered off a missing-row reconstructed Au(110) surface under grazing incidence

    SciTech Connect

    Chen, L.; Shen, J.; Esaulov, V. A.; Valdes, J. E.; Vargas, P.

    2011-03-15

    A joint experimental and theoretical study of energy loss is presented for 1-to-4-keV fluorine negative ions in grazing scattering on a missing-row reconstructed Au(110) surface. Measurements of energy losses for various azimuthal orientations of the crystal have been performed by means of a time-of-flight method with a pulsed beam. The dependence of the fraction of surviving negative ions on azimuthal angles, was determined. Our energy-loss data are discussed in light of trajectory and stopping-power calculations, where the explicit inclusion of the nonuniform electron density at the surface provides good agreement with the experimental data. The simulation allows us to delineate various trajectory classes that correspond to different contributions in the energy-loss spectra for various azimuthal orientations of the surface.

  15. Diagnostics of ion beam generated from a Mather type plasma focus device

    SciTech Connect

    Lim, L. K. Ngoi, S. K. Wong, C. S. Yap, S. L.

    2014-03-05

    Diagnostics of ion beam emission from a 3 kJ Mather-type plasma focus device have been performed for deuterium discharge at low pressure regime. Deuterium plasma focus was found to be optimum at pressure of 0.2 mbar. The energy spectrum and total number of ions per shot from the pulsed ion beam are determined by using biased ion collectors, Faraday cup, and solid state nuclear track detector CR-39. Average energy of the ion beam obtained is about 60 keV. Total number of the ions has been determined to be in the order of 10{sup 11} per shot. Solid state nuclear track detectors (SSNTD) CR39 are employed to measure the particles at all angular direction from end on (0°) to side on (90°). Particle tracks are registered by SSNTD at 30° to 90°, except the one at the end-on 0°.

  16. Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera.

    PubMed

    Baumann, Thomas M; Lapierre, Alain; Kittimanapun, Kritsada; Schwarz, Stefan; Leitner, Daniela; Bollen, Georg

    2014-07-01

    The Electron Beam Ion Trap (EBIT) of the National Superconducting Cyclotron Laboratory at Michigan State University is used as a charge booster and injector for the currently commissioned rare isotope re-accelerator facility ReA. This EBIT charge breeder is equipped with a unique superconducting magnet configuration, a combination of a solenoid and a pair of Helmholtz coils, allowing for a direct observation of the ion cloud while maintaining the advantages of a long ion trapping region. The current density of its electron beam is a key factor for efficient capture and fast charge breeding of continuously injected, short-lived isotope beams. It depends on the radius of the magnetically compressed electron beam. This radius is measured by imaging the highly charged ion cloud trapped within the electron beam with a pinhole camera, which is sensitive to X-rays emitted by the ions with photon energies between 2 keV and 10 keV. The 80%-radius of a cylindrical 800 mA electron beam with an energy of 15 keV is determined to be r(80%) = (212 ± 19)μm in a 4 T magnetic field. From this, a current density of j = (454 ± 83)A/cm(2) is derived. These results are in good agreement with electron beam trajectory simulations performed with TriComp and serve as a test for future electron gun design developments.

  17. Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera

    NASA Astrophysics Data System (ADS)

    Baumann, Thomas M.; Lapierre, Alain; Kittimanapun, Kritsada; Schwarz, Stefan; Leitner, Daniela; Bollen, Georg

    2014-07-01

    The Electron Beam Ion Trap (EBIT) of the National Superconducting Cyclotron Laboratory at Michigan State University is used as a charge booster and injector for the currently commissioned rare isotope re-accelerator facility ReA. This EBIT charge breeder is equipped with a unique superconducting magnet configuration, a combination of a solenoid and a pair of Helmholtz coils, allowing for a direct observation of the ion cloud while maintaining the advantages of a long ion trapping region. The current density of its electron beam is a key factor for efficient capture and fast charge breeding of continuously injected, short-lived isotope beams. It depends on the radius of the magnetically compressed electron beam. This radius is measured by imaging the highly charged ion cloud trapped within the electron beam with a pinhole camera, which is sensitive to X-rays emitted by the ions with photon energies between 2 keV and 10 keV. The 80%-radius of a cylindrical 800 mA electron beam with an energy of 15 keV is determined to be r_{80%}=(212± 19)μm in a 4 T magnetic field. From this, a current density of j = (454 ± 83)A/cm2 is derived. These results are in good agreement with electron beam trajectory simulations performed with TriComp and serve as a test for future electron gun design developments.

  18. Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera

    SciTech Connect

    Baumann, Thomas M. Lapierre, Alain Kittimanapun, Kritsada; Schwarz, Stefan; Leitner, Daniela; Bollen, Georg

    2014-07-15

    The Electron Beam Ion Trap (EBIT) of the National Superconducting Cyclotron Laboratory at Michigan State University is used as a charge booster and injector for the currently commissioned rare isotope re-accelerator facility ReA. This EBIT charge breeder is equipped with a unique superconducting magnet configuration, a combination of a solenoid and a pair of Helmholtz coils, allowing for a direct observation of the ion cloud while maintaining the advantages of a long ion trapping region. The current density of its electron beam is a key factor for efficient capture and fast charge breeding of continuously injected, short-lived isotope beams. It depends on the radius of the magnetically compressed electron beam. This radius is measured by imaging the highly charged ion cloud trapped within the electron beam with a pinhole camera, which is sensitive to X-rays emitted by the ions with photon energies between 2 keV and 10 keV. The 80%-radius of a cylindrical 800 mA electron beam with an energy of 15 keV is determined to be r{sub 80%}=(212±19)μm in a 4 T magnetic field. From this, a current density of j = (454 ± 83)A/cm{sup 2} is derived. These results are in good agreement with electron beam trajectory simulations performed with TriComp and serve as a test for future electron gun design developments.

  19. Ion beam modification of injection moulded polymere materials

    NASA Astrophysics Data System (ADS)

    Wolf, G. K.; Kersten, H. J.

    1998-05-01

    Ion beam based treatments and processes are an ecologically friendly alternative for the metallization of polymers. Nowadays mainly chemical and electrochemical and plasma assisted techniques are used. In this contribution the copper metallization of high temperature thermoplasts using ion beam assisted deposition (IBAD) was studied. The applications in mind were magnetic shielding of cases for sensors. The influence of ion beam intensity and energy, deposition rate, preconditioning and substrate material on the Cu adhesion was investigated. As materials PPS (Polyphenylene sulfide) and LCP (Liquid Crystal Polymer) with different filling materials were used. It could be shown that the adhesion reacts very critical to the type of polymer and the type and concentration of filling material. The IBAD parameters giving best results are I/A ratios of 0.005-0.01 and energies of 0.5-2 keV. The highest adhesion force (≈27 N/mm 2) was measured on PPS. For LCP thin Ti interlayers increased the adhesion force ≈50% up to values above 10 N/mm 2.

  20. The Negative Ion based Diagnostic Neutral Beam for ITER

    NASA Astrophysics Data System (ADS)

    Schunke, B.; Decamps, H.; Dremel, M.; Hemsworth, R.; Tanga, A.; Bandyophadhyay, M.; Baruah, B.; Chakraborty, A.; Rotti, C.; Shah, S.; Singh, M.; Singh, N.

    2009-11-01

    The ITER dedicated Diagnostic Neutral Beam (DNB) is under construction. It is the basis for the Motional Stark Effect measurements at the ITER plasma edge and charge exchange spectroscopy. The DNB shares many features of the ITER Heating Neutral Beams (HNBs), but will operate only in hydrogen and inject ˜2 MW of 100 keV of H^0 into the ITER plasmas. The same Cs seeded RF negative ion source is used as for the HNBs. The strong influence of the residual fields on the H^- and electrons in the accelerator has led to a new design of the magnetic filter in the ion source. Electron dumps consisting of parallel, vertical, cooled, plates between groups of beamlets immediately downstream of the accelerator prevent excessive electron power reaching the DNB cryopumps. The 4 channel gas neutralizer is made of cooled panels with special protection for the leading edges. Residual ions are deflected electrostatically onto cooled panels based on CuCrZr Heat Transfer Elements. A retractable calorimeter allows commissioning and beam profile measurements. It will be shown how imposed commonalities with the HNBs have influenced the design choices. The baseline DNB operating scenario and the engineering issues (lifetime, fatigue etc.), will be discussed.

  1. Dependence of low energy ion beam exposure effects in silicon on ion species, exposure history, and material properties

    NASA Astrophysics Data System (ADS)

    Davis, R. J.; Climent, A.; Fonash, S. J.

    1985-03-01

    Several groups have shown that low energy (25-1500 eV) ion bombardment of silicon causes significant surface damage; these disordered layers are hundreds of ángströms deep and are easily characterized by electron spin resonance and Rutherford backscattering techniques. This surface damage also manifests itself as positive charge residing at the metal-semiconductor interface of metal contacts to these layers. Recently we have shown that this damage increases with the inverse of the ion size, if ion energy is kept constant. However, we have demonstrated that impingement by the lightest of ions (H +) can electrically passivate the damage caused by other ions; namely, hydrogen itself causes extensive damage, but it also passivates by tying up dangling bonds. This interaction of hydrogen with the damage caused by other ions is fairly complex. For example, the 0.4 keV hydrogen ions used to completely passivate 1.0 keV Ar + ion damage (as determined by electrical measurements) cause significant disorder and result in electrically active damage, when not preceded by the Ar + impingement. Thus low energy ion beam damage is found to depend on ion size, ion chemical activity, and sample exposure history. In addition, we have also seen significant differences in the annealing behavior of ion damage in float-zoned versus Czochralski-grown silicon. While 1.0 keV Ar + damage of CZ silicon anneals only at 1000°C, damaged FZ silicon anneals nearly completely at 800°C. Such behavior strongly suggests that background oxygen and carbon may play a role in ion beam damage of silicon.

  2. Ion beam mixing of ceramic/metal interfaces

    NASA Astrophysics Data System (ADS)

    Corts, T.; Traverse, A.; Bolse, W.

    1993-06-01

    In order to investigate the interplay between chemical and collisional effects during ion beam mixing of ceramic/metal interfaces, Ni 3N- and TiN-coated Al and AIN-coated Ni, Cr and Ti ( d ≈ 100 m) were irradiated with 500 keV Xe ions at 80 K. Rutherford backscattering spectrometry with 0.9-1.5 MeV α-particles and resonant nuclear reaction analysis via the reactions 15N(p,αγ) and 27Al(p,γ) were used to determine the interfacial atomic distributions prior to and after irradiation. The mixing rate of the AlN/metal systems agrees well with the predictions of the ballistic model, while mixing of Ni 3N/Al is clearly dominated by diffusion in a thermal spike. The slightly enhanced mixing in TiN/Al also hints at the contribution of a spike.

  3. Autoresonance Cooling of Ions in an Electrostatic Ion Beam Trap

    NASA Astrophysics Data System (ADS)

    Gangwar, R. K.; Saha, K.; Heber, O.; Rappaport, M. L.; Zajfman, D.

    2017-09-01

    Autoresonance (AR) cooling of a bunch of ions oscillating inside an electrostatic ion beam trap is demonstrated for the first time. The relatively wide initial longitudinal velocity distribution is reduced by at least an order of magnitude using AR acceleration and ramping forces. The hot ions escaping the bunch are not lost from the system but continue to oscillate in the trap outside of the bunch and may be further cooled by successive AR processes. Ion-ion collisions inside the bunch close to the turning points in the trap's mirrors contribute to the thermalization of the ions. This cooling method can be applied to any mass and any charge.

  4. A pencil beam algorithm for helium ion beam therapy.

    PubMed

    Fuchs, Hermann; Strobele, Julia; Schreiner, Thomas; Hirtl, Albert; Georg, Dietmar

    2012-11-01

    To develop a flexible pencil beam algorithm for helium ion beam therapy. Dose distributions were calculated using the newly developed pencil beam algorithm and validated using Monte Carlo (MC) methods. The algorithm was based on the established theory of fluence weighted elemental pencil beam (PB) kernels. Using a new real-time splitting approach, a minimization routine selects the optimal shape for each sub-beam. Dose depositions along the beam path were determined using a look-up table (LUT). Data for LUT generation were derived from MC simulations in water using GATE 6.1. For materials other than water, dose depositions were calculated by the algorithm using water-equivalent depth scaling. Lateral beam spreading caused by multiple scattering has been accounted for by implementing a non-local scattering formula developed by Gottschalk. A new nuclear correction was modelled using a Voigt function and implemented by a LUT approach. Validation simulations have been performed using a phantom filled with homogeneous materials or heterogeneous slabs of up to 3 cm. The beams were incident perpendicular to the phantoms surface with initial particle energies ranging from 50 to 250 MeV/A with a total number of 10(7) ions per beam. For comparison a special evaluation software was developed calculating the gamma indices for dose distributions. In homogeneous phantoms, maximum range deviations between PB and MC of less than 1.1% and differences in the width of the distal energy fall off of the Bragg-Peak from 80% to 20% of less than 0.1 mm were found. Heterogeneous phantoms using layered slabs satisfied a γ-index criterion of 2%/2mm of the local value except for some single voxels. For more complex phantoms using laterally arranged bone-air slabs, the γ-index criterion was exceeded in some areas giving a maximum γ-index of 1.75 and 4.9% of the voxels showed γ-index values larger than one. The calculation precision of the presented algorithm was considered to be sufficient

  5. A pencil beam algorithm for helium ion beam therapy

    SciTech Connect

    Fuchs, Hermann; Stroebele, Julia; Schreiner, Thomas; Hirtl, Albert; Georg, Dietmar

    2012-11-15

    Purpose: To develop a flexible pencil beam algorithm for helium ion beam therapy. Dose distributions were calculated using the newly developed pencil beam algorithm and validated using Monte Carlo (MC) methods. Methods: The algorithm was based on the established theory of fluence weighted elemental pencil beam (PB) kernels. Using a new real-time splitting approach, a minimization routine selects the optimal shape for each sub-beam. Dose depositions along the beam path were determined using a look-up table (LUT). Data for LUT generation were derived from MC simulations in water using GATE 6.1. For materials other than water, dose depositions were calculated by the algorithm using water-equivalent depth scaling. Lateral beam spreading caused by multiple scattering has been accounted for by implementing a non-local scattering formula developed by Gottschalk. A new nuclear correction was modelled using a Voigt function and implemented by a LUT approach. Validation simulations have been performed using a phantom filled with homogeneous materials or heterogeneous slabs of up to 3 cm. The beams were incident perpendicular to the phantoms surface with initial particle energies ranging from 50 to 250 MeV/A with a total number of 10{sup 7} ions per beam. For comparison a special evaluation software was developed calculating the gamma indices for dose distributions. Results: In homogeneous phantoms, maximum range deviations between PB and MC of less than 1.1% and differences in the width of the distal energy falloff of the Bragg-Peak from 80% to 20% of less than 0.1 mm were found. Heterogeneous phantoms using layered slabs satisfied a {gamma}-index criterion of 2%/2mm of the local value except for some single voxels. For more complex phantoms using laterally arranged bone-air slabs, the {gamma}-index criterion was exceeded in some areas giving a maximum {gamma}-index of 1.75 and 4.9% of the voxels showed {gamma}-index values larger than one. The calculation precision of the

  6. Negative Decaborane Ion Beam from ITEP Bernas Ion Source

    SciTech Connect

    Petrenko, S. V.; Kuibeda, R. P.; Kulevoy, T. V.; Batalin, V. A.; Pershin, V. I.; Koslov, A. V.; Stasevich, Yu. B.; Koshelev, V. A.; Hershcovitch, A.; Johnson, B. M.; Oks, E. M.; Gushenets, V. I.; Poole, H. J.

    2007-08-10

    A joint research and development effort focusing on the design of steady state, intense ion sources has been in progress for the past two and a half years with a couple of Russian institutions. The ultimate goal of the effort is to meet the two, energy extreme range needs of mega-electron-volt and 100's of electron-volt ion implanters. This endeavor has already resulted in record steady state output currents of higher charge state antimony and phosphorous ions to meet high-energy implantation requirements. For low energy ion implantation, R and D efforts have involved molecular ions and a novel plasmaless/gasless deceleration method. To date, 1 emA of positive decaborane ions were extracted at 10 keV and a smaller current of negative decaborane ions were also extracted. Though of scientific interest, negative decaborane ions did not attract interest from industry, since the semiconductor ion implant industry seems to have solved the wafer-charging problem. This paper describes conditions under which negative decaborane ions are formed and extracted from a Bernas ion source.

  7. Ion beam modification of polyacetylene films

    NASA Astrophysics Data System (ADS)

    Lin, Senhao; Sheng, Kanglong; Bao, Jinrong; Rong, Tingwen; Zhou, Zhiyi; Zhang, Lanping; Zhu, Dezhang; Shen, Zhiquan; Yan, Mujie

    1989-03-01

    Low energy ion implantation of polyacetylene films synthesized with rare earth compound catalysts have been studied for potassium, sodium and iodine at the energy region of 15 to 30 keV. Film samples prepared in different ways, thermally treated and/or chemically doped, were irradiated up to 1 × 10 17 ions/cm 2. The resulting surface property modifications of the (CH) x films were examined by various kinds of techniques. Compensation effects of the dopants and electrical conductivity changes in the implanted regions were observed. Some of the implanted film samples exhibited diode like characteristics. Discussions on the experimental results are presented.

  8. Nuclear fusion of advanced fuels using converging focused ion beams

    NASA Astrophysics Data System (ADS)

    Egle, Brian James

    The Six Ion Gun Fusion Experiment (SIGFE) was designed and built to investigate a possible avenue to increase the reaction rate efficiency of the D-D and D-3He nuclear fusion reactions in Inertial Electrostatic Confinement (IEC) devices to the levels required for several non-electric applications of nuclear fusion. The SIGFE is based on the seminal IEC experiment published by Hirsch in 1967, and is the first experiment to recreate the results and unique features of the Hirsch device. The SIGFE used six identical ion beams to focus and converge deuterium and helium-3 ions into a sphere of less than 2 mm at nearly mono-energetic ion energies up to 150 keV. With improved ion optics and diagnostics, the SIGFE concluded that within the investigated parameter space, the region where the ion beams converged accounted for less than 0.2% of the total D-D fusion reactions. The maximum D-D fusion rates were observed when the ion beams were intentionally defocused to strike the inside surface of the cathode lenses. In this defocused state, the total D-D fusion rate increased when the chamber pressure was decreased. The maximum D-D fusion rate was 4.3 x 107 neutrons per second at a cathode voltage of -130 kV, a total cathode current of 10 mA, and a chamber pressure of 27 mPa. The D and 3He ion beams were produced in six self-contained ion gun modules. The modules were each capable of at least 4 mA of ion current while maintaining a main chamber pressure as low as 13 mPa. The theoretically calculated extractable ion current agreed with the experiment within a factor of 2. A concept was also developed and evaluated for the production of radioisotopes from the 14.7 MeV D-3He fusion protons produced in an IEC device. Monte Carlo simulations of this concept determined that a D-3He fusion rate on the order of 1011 s-1 would be required for an IEC device to produce 1 mCi of the 11C radioisotope.

  9. Transmission sputtering of gold thin films by low-energy (< 1 keV) xenon ions. I. The system and the measurement

    NASA Astrophysics Data System (ADS)

    Ayrault, Guy; Seidman, David N.

    1982-10-01

    A novel system for direct measurement of the transmission-sputtering yields of ion-irradiated thin films is described. The system was specifically designed for the study of the transmission sputtering caused by low-energy (<1 keV) xenon ions. The xenon ion beam employed is first mass-analyzed in a specially constructed corssed magnetic- and electric-field mass spectrometer; this analyzer eliminates all energetic neutral and singly charged ions of mass less than 40 amu; it is also expected that ≤2% of the xenon ions which actually reach a specimen are doubly charged. The analyzed xenon ion beam is made to impinge on a gold thin film (˜100-500 Å thick) which is mounted in a JEM 200 transmission electron-microscope holder. The temperature of the specimen can be varied between ˜25 and 300 K employing a continuous transfer liquid-helium cryostat. The particles (atoms or ions) ejected from the unirradiated surface of the gold thin film are detected by two channeltron electron-multiplier arrays (CEMA) in the Chevron configuration; the Chevron detector is able to detect individual transmission-sputtered particles when operated in the saturated mode. To further enhance resolution, the electron cascades (produced by the CEMA), are amplified and shaped electronically into uniform square pulses. The shaped signals are detected with an Ithaco 391A lock-in amplifier (LIA). With the aid of a ratiometer feature in the LIA, we are able to measure directly the ratio of the transmission-sputtered current It to the incident ion current Ib; for Ibn=1 μA cm-2, a ratio of It/Ib as small as 1×10-9 has been measured. A detailed discussion of the calibration procedure and the experimental errors, involved in this technique, are also presented.

  10. Mass spectrometer and methods of increasing dispersion between ion beams

    DOEpatents

    Appelhans, Anthony D.; Olson, John E.; Delmore, James E.

    2006-01-10

    A mass spectrometer includes a magnetic sector configured to separate a plurality of ion beams, and an electrostatic sector configured to receive the plurality of ion beams from the magnetic sector and increase separation between the ion beams, the electrostatic sector being used as a dispersive element following magnetic separation of the plurality of ion beams. Other apparatus and methods are provided.

  11. Graphene engineering by neon ion beams

    SciTech Connect

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-02-18

    Achieving the ultimate limits of materials and device performance necessitates the engineering of matter with atomic, molecular, and mesoscale fidelity. While common for organic and macromolecular chemistry, these capabilities are virtually absent for 2D materials. In contrast to the undesired effect of ion implantation from focused ion beam (FIB) lithography with gallium ions, and proximity effects in standard e-beam lithography techniques, the shorter mean free path and interaction volumes of helium and neon ions offer a new route for clean, resist free nanofabrication. Furthermore, with the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of graphene based nanoelectronics is coming to the forefront. Here, we will discuss the use of energetic Ne ions in engineering graphene devices and explore the mechanical, electromechanical and chemical properties of the ion-milled devices using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we demonstrate that the mechanical, electrical and optical properties of the exact same devices can be quantitatively extracted. Additionally, the effect of defects inherent in ion beam direct-write lithography, on the overall performance of the fabricated devices is elucidated.

  12. Graphene engineering by neon ion beams

    DOE PAGES

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; ...

    2016-02-18

    Achieving the ultimate limits of materials and device performance necessitates the engineering of matter with atomic, molecular, and mesoscale fidelity. While common for organic and macromolecular chemistry, these capabilities are virtually absent for 2D materials. In contrast to the undesired effect of ion implantation from focused ion beam (FIB) lithography with gallium ions, and proximity effects in standard e-beam lithography techniques, the shorter mean free path and interaction volumes of helium and neon ions offer a new route for clean, resist free nanofabrication. Furthermore, with the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of graphenemore » based nanoelectronics is coming to the forefront. Here, we will discuss the use of energetic Ne ions in engineering graphene devices and explore the mechanical, electromechanical and chemical properties of the ion-milled devices using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we demonstrate that the mechanical, electrical and optical properties of the exact same devices can be quantitatively extracted. Additionally, the effect of defects inherent in ion beam direct-write lithography, on the overall performance of the fabricated devices is elucidated.« less

  13. Future Directions in Ion Beam Therapy

    NASA Astrophysics Data System (ADS)

    Habermehl, Daniel; Combs, Stephanie; Debus, Jürgen

    There is a growing interest in ion beam therapy (IBT) worldwide which has led to an increasing number of new treatment facilities. This development is accompanied by intensive radiobiological, physical and clinical research of both proton therapy (PT) and carbon ion radiotherapy (CIRT). Current developments in IBT with high impact for future challenges will be summarized in this chapter.

  14. Beam current controller for laser ion source

    DOEpatents

    Okamura, Masahiro

    2014-10-28

    The present invention relates to the design and use of an ion source with a rapid beam current controller for experimental and medicinal purposes. More particularly, the present invention relates to the design and use of a laser ion source with a magnetic field applied to confine a plasma flux caused by laser ablation.

  15. Ion beam parameters of a plasma accelerator

    SciTech Connect

    Nazarov, V.G.; Vinogradov, A.M.; Veselovzorov, A.N.; Efremov, V.K.

    1987-08-01

    The aim of this investigation was to determine the dependences of the current density, the energy, and the divergence of the ion beams of an UZDP-type source (a plasma accelerator with closed electron drift in the accelerator channel and an extended zone of ion acceleration) on the parameters which determine its performance, and to establish qualitative relationships between these values.

  16. Particle radiotherapy with carbon ion beams

    PubMed Central

    2013-01-01

    Carbon ion radiotherapy offers superior dose conformity in the treatment of deep-seated malignant tumours compared with conventional X-ray therapy. In addition, carbon ion beams have a higher relative biological effectiveness compared with protons or X-ray beams. The algorithm of treatment planning and beam delivery system is tailored to the individual parameters of the patient. The present article reviews the available literatures for various disease sites including the head and neck, skull base, lung, liver, prostate, bone and soft tissues and pelvic recurrence of rectal cancer as well as physical and biological properties. PMID:23497542

  17. Optical studies of ion-beam synthesized metal alloy nanoparticles

    SciTech Connect

    Magudapathy, P. Srivatsava, S. K.; Gangopadhyay, P.; Amirthapandian, S.; Sairam, T. N.; Panigrahi, B. K.

    2015-06-24

    Au{sub x}Ag{sub 1-x} alloy nanoparticles with tunable surface plasmon resonance (SPR) have been synthesized on a silica glass substrate. A small Au foil on an Ag foil is irradiated as target substrates such that ion beam falls on both Ag foil and Au foils. Silica slides are kept at an angle ∼45° with respect to the metallic foils. While irradiating the metallic foils with 100 keV Ar{sup +} ions, sputtered Au and Ag atoms get deposited on the silica-glass. In this configuration the foils have been irradiated by Ar{sup +} ions to various fluences at room temperature and the sputtered species are collected on silica slides. Formation of Au{sub x}Ag{sub 1-x} nanoparticles has been confirmed from the optical absorption measurements. With respect to the exposure area of Au and Ag foils to the ion beam, the SPR peak position varies from 450 to 500 nm. Green photoluminescence has been observed from these alloy metal nanoparticles.

  18. Ion beam generated modes in the lower hybrid frequency range in a laboratory magnetoplasma

    NASA Astrophysics Data System (ADS)

    van Compernolle, Bart; Tripathi, Shreekrishna; Gekelman, Walter; Pribyl, Patrick

    2013-10-01

    The interaction of a fast ion beam with a low β plasma has been studied in the laboratory. Experiments were performed at the LArge Plasma Device (LAPD) at UCLA. The experiments were done in a Helium plasma (n ~=1012cm-3 , B0 = 1000 G - 1800 G, fpe /fce ~= 1 - 5 , Te ~= 4eV , vte <ion beam is either a Helium beam or Hydrogen beam with energies ranging from 5 keV to 18 keV. The fast ion velocity is on the order of the Alfvén velocity. The beam is injected from the end of the machine, and spirals down the linear device. Waves were observed below fci in the shear Alfvén wave regime, and in a broad spectrum above fci in the lower hybrid frequency range. The wave generation was studied for various plasma parameters, as well as for different beam energies and pitch angles. The waves were measured with 3-axis electric and magnetic probes. Detailed measurements of the 2D perpendicular mode structure will be shown. Progress on a theoretical framework of the wave generation by the ion beam will be presented along with comparisons to the measured wave properties. The work was performed at the LArge Plasma Device at the Basic Plasma Science Facility (BaPSF) at UCLA, funded by DOE/NSF.

  19. The role of space charge compensation for ion beam extraction and ion beam transport (invited)

    SciTech Connect

    Spädtke, Peter

    2014-02-15

    Depending on the specific type of ion source, the ion beam is extracted either from an electrode surface or from a plasma. There is always an interface between the (almost) space charge compensated ion source plasma, and the extraction region in which the full space charge is influencing the ion beam itself. After extraction, the ion beam is to be transported towards an accelerating structure in most cases. For lower intensities, this transport can be done without space charge compensation. However, if space charge is not negligible, the positive charge of the ion beam will attract electrons, which will compensate the space charge, at least partially. The final degree of Space Charge Compensation (SCC) will depend on different properties, like the ratio of generation rate of secondary particles and their loss rate, or the fact whether the ion beam is pulsed or continuous. In sections of the beam line, where the ion beam is drifting, a pure electrostatic plasma will develop, whereas in magnetic elements, these space charge compensating electrons become magnetized. The transport section will provide a series of different plasma conditions with different properties. Different measurement tools to investigate the degree of space charge compensation will be described, as well as computational methods for the simulation of ion beams with partial space charge compensation.

  20. Long-pulse beam acceleration of MeV-class H(-) ion beams for ITER NB accelerator.

    PubMed

    Umeda, N; Kashiwagi, M; Taniguchi, M; Tobari, H; Watanabe, K; Dairaku, M; Yamanaka, H; Inoue, T; Kojima, A; Hanada, M

    2014-02-01

    In order to realize neutral beam systems in International Thermonuclear Experimental Reactor whose target is to produce a 1 MeV, 200 A/m(2) during 3600 s D(-) ion beam, the electrostatic five-stages negative ion accelerator so-called "MeV accelerator" has been developed at Japan Atomic Energy Agency. To extend pulse length, heat load of the acceleration grids was reduced by controlling the ion beam trajectory. Namely, the beam deflection due to the residual magnetic field of filter magnet was suppressed with the newly developed extractor with a 0.5 mm off-set aperture displacement. The new extractor improved the deflection angle from 6 mrad to 1 mrad, resulting in the reduction of direct interception of negative ions from 23% to 15% of the total acceleration power, respectively. As a result, the pulse length of 130 A/m(2), 881 keV H(-) ion beam has been successfully extended from a previous value of 0.4 s to 8.7 s. This is the first long pulse negative ion beam acceleration over 100 MW/m(2).

  1. Holifield Radioactive Ion Beam Facility Status

    SciTech Connect

    Stracener, Daniel W; Beene, James R; Dowling, Darryl T; Juras, Raymond C; Liu, Yuan; Meigs, Martha J; Mendez, II, Anthony J; Mueller, Paul Edward; Sinclair, John William; Tatum, B Alan; Sinclair IV, John W

    2009-01-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) at Oak Ridge National Laboratory (ORNL) produces high-quality beams of short-lived radioactive isotopes for nuclear science research, and is currently unique worldwide in the ability to provide neutron-rich fission fragment beams post-accelerated to energies above the Coulomb barrier. HRIBF is undergoing a multi-phase upgrade. Phase I (completed 2005) was construction of the High Power Target Laboratory to provide the on-going Isotope Separator On-Line (ISOL) development program with a venue for testing new targets, ion sources, and radioactive ion beam (RIB) production techniques with high-power beams. Phase II, which is on schedule for completion in September 2009, is the Injector for Radioactive Ion Species 2 (IRIS2), a second RIB production station that will improve facility reliability and accommodate new ion sources, new RIB production targets, and some innovative RIB purification techniques, including laser applications. The Phase III goal is to substantially improve facility performance by replacing or supplementing the Oak Ridge Isochronous Cyclotron (ORIC) production accelerator with either a high-power 25-50 MeV electron accelerator or a high-current multi-beam commercial cyclotron. Either upgrade is applicable to R&D on isotope production for medical or other applications.

  2. Status report on the development of a tubular electron beam ion source

    NASA Astrophysics Data System (ADS)

    Donets, E. D.; Donets, E. E.; Becker, R.; Liljeby, L.; Rensfelt, K.-G.; Beebe, E. N.; Pikin, A. I.

    2004-05-01

    The theoretical estimations and numerical simulations of tubular electron beams in both beam and reflex mode of source operation as well as the off-axis ion extraction from a tubular electron beam ion source (TEBIS) are presented. Numerical simulations have been done with the use of the IGUN and OPERA-3D codes. Numerical simulations with IGUN code show that the effective electron current can reach more than 100 A with a beam current density of about 300-400 A/cm2 and the electron energy in the region of several KeV with a corresponding increase of the ion output. Off-axis ion extraction from the TEBIS, being the nonaxially symmetric problem, was simulated with OPERA-3D (SCALA) code. The conceptual design and main parameters of new tubular sources which are under consideration at JINR, MSL, and BNL are based on these simulations.

  3. Ion sources and targets for radioactive beams

    SciTech Connect

    Schiffer, J.P.; Back, B.B.; Ahmad, I.

    1995-08-01

    A high-intensity ISOL-type radioactive beam facility depends critically on the performance of the target/ion source system. We developed a concept for producing high-intensity secondary beams of fission fragments, such as {sup 132}Sn, using a two-part target and ion source combination. The idea involves stopping a 1000-kW beam of 200-MeV deuterons in a target of Be or U to produce a secondary beam of neutrons. Just behind the neutron production target is a second target, typically a porous form of UC, coupled to an ISOL-type ion source. In December 1994, we tested this concept with 200-MeV deuterons at low intensity in an experiment at the NSCL. The yields of characteristic gamma rays were measured and confirmed our predictions.

  4. Laser-cooled continuous ion beams

    SciTech Connect

    Schiffer, J.P.; Hangst, J.S.; Nielsen, J.S.

    1995-08-01

    A collaboration with a group in Arhus, Denmark, using their storage ring ASTRID, brought about better understanding of ion beams cooled to very low temperatures. The longitudinal Schottky fluctuation noise signals from a cooled beam were studied. The fluctuation signals are distorted by the effects of space charge as was observed in earlier measurements at other facilities. However, the signal also exhibits previously unobserved coherent components. The ions` velocity distribution, measured by a laser fluorescence technique suggests that the coherence is due to suppression of Landau damping. The observed behavior has important implications for the eventual attainment of a crystalline ion beam in a storage ring. A significant issue is the transverse temperature of the beam -- where no direct diagnostics are available and where molecular dynamics simulations raise interesting questions about equilibrium.

  5. Ion beam driven HEDP experiments on NDCX

    NASA Astrophysics Data System (ADS)

    Bieniosek, F. M.; Henestroza, E.; Lidia, S.; More, R. M.; Ni, P. A.; Roy, P. K.; Seidl, P. A.; Barnard, J. J.

    2010-11-01

    Intense beams of heavy ions are capable of delivering precise and uniform beam energy deposition, with the capability to heat volumetric samples of any solid-phase target material to high energy density. The WDM conditions are achieved by combined longitudinal and transverse space-charge neutralized drift compression of the ion beam to provide a hot spot on the target with a beam spot size of about 1 mm. Initial experiments use a 0.3 MeV, 30-mA K^+ beam from the NDCX-I accelerator to heat foil targets such as Au, Pt, W, Al and Si. The NDCX-1 beam contains a low-intensity uncompressed pulse up to >10 μs of intensity ˜0.4 MW/cm^2, and a high-intensity compressed pulse (FWHM 2-3 ns and fluence ˜4 mJ). WDM experiments heat targets by both the compressed and uncompressed parts of the NDCX-I beam, and explore measurement of temperature, droplet formation and other target parameters. Future plans include target experiments using the NDCX-II accelerator, which is designed to heat targets at the Bragg peak using a 2-3 MeV lithium ion beam.

  6. Ion beam driven warm dense matter experiments

    NASA Astrophysics Data System (ADS)

    Bieniosek, F. M.; Ni, P. A.; Leitner, M.; Roy, P. K.; More, R.; Barnard, J. J.; Kireeff Covo, M.; Molvik, A. W.; Yoneda, H.

    2007-11-01

    We report plans and experimental results in ion beam-driven warm dense matter (WDM) experiments. Initial experiments at LBNL are at 0.3-1 MeV K+ beam (below the Bragg peak), increasing toward the Bragg peak in future versions of the accelerator. The WDM conditions are envisioned to be achieved by combined longitudinal and transverse neutralized drift compression to provide a hot spot on the target with a beam spot size of about 1 mm, and pulse length about 1-2 ns. The range of the beams in solid matter targets is about 1 micron, which can be lengthened by using porous targets at reduced density. Initial experiments include an experiment to study transient darkening at LBNL; and a porous target experiment at GSI heated by intense heavy-ion beams from the SIS 18 storage ring. Further experiments will explore target temperature and other properties such as electrical conductivity to investigate phase transitions and the critical point.

  7. Ion beams from laser-generated plasmas

    NASA Technical Reports Server (NTRS)

    Hughes, R. H.; Anderson, R. J.; Gray, L. G.; Rosenfeld, J. P.; Manka, C. K.; Carruth, M. R.

    1980-01-01

    The paper describes the space-charge-limited beams produced by the plasma blowoffs generated by 20-MW bursts of 1.06-micron radiation from an active Q-switched Nd:YAG laser. Laser power densities near 10 to the 11th/sq cm on solid targets generate thermalized plasma plumes which drift to a 15-kV gridded extraction gap where the ions are extracted, accelerated, and electrostatically focused; the spatially defined ion beams are then magnetically analyzed to determine the charge state content in the beams formed from carbon, aluminum, copper, and lead targets. This technique preserves time-of-flight (TOF) information in the plasma drift region, which permits plasma ion temperatures and mass flow velocities to be determined from the Maxwellian ion curve TOF shapes for the individual charge species.

  8. Fundamental Concepts of Ion-Beam Processing

    NASA Astrophysics Data System (ADS)

    Averback, R. S.; Bellon, P.

    The basic concepts underlying the response of materials to ion-beam irradiation are outlined. These include the slowing of energetic ions, the creation of defects, sputtering, ion-beam mixing, the acceleration of kinetic processes, and phase transformations. Several examples are cited to illustrate how each of these concepts can be exploited to modify materials in ways not easily achieved, or not even possible, by more conventional processing methods. The chapter attempts to provide a physical understanding of the basic effects of ion-beam irradiation on materials, to enable readers in other areas of research to better understand the more technical chapters that follow, and to develop ideas relevant to their own disciplines. We provide references to more quantitative treatments of the topics covered here.

  9. Surface modification using ionic liquid ion beams

    NASA Astrophysics Data System (ADS)

    Takaoka, Gikan H.; Hamaguchi, Takuya; Takeuchi, Mitsuaki; Ryuto, Hiromichi

    2014-12-01

    We developed an ionic liquid (IL) ion source using 1-butyl-3-methylimidazolium hexafluorophosphate (BMIM-PF6) and produced IL ion beams by applying a high electric field between the tip and the extractor. Time-of-flight measurements showed that small cluster and fragment ions were contained in the positive and negative ion beams. The positive and negative cluster ions were deposited on Si(1 0 0) substrates. X-ray photoelectron spectroscopy measurements showed that the composition of the deposited layers was similar to that of an IL solvent. This suggests that a cation (A+) or an anion (B-) was attached to an IL cluster (AB)n, resulting in the formation of positive cluster ions (AB)nA+ or negative cluster ions (AB)nB-, respectively. The surfaces of the IL layers deposited on Si(1 0 0) substrates were flat at an atomic level for positive and negative cluster ion irradiation. Moreover, the contact angles of the deposited layers were similar to that of the IL solvent. Thus, surface modification of Si(1 0 0) substrates was successfully demonstrated with BMIM-PF6 cluster ion beams.

  10. Electron Cooling of Intense Ion Beam

    SciTech Connect

    Dietrich, J.; Kamerdjiev, V.; Maier, R.; Prasuhn, D.; Stein, J.; Stockhorst, H.; Korotaev, Yu.; Meshkov, I.; Sidorin, A.; Smirnov, A.

    2006-03-20

    Results of experimental studies of the electron cooling of a proton beam at COSY (Juelich, Germany) are presented. Intensity of the proton beam is limited by two general effects: particle loss directly after the injection and development of instability in a deep cooled ion beam. Results of the instability investigations performed at COSY during last years are presented in this report in comparison with previous results from HIMAC (Chiba, Japan) CELSIUS (Uppsala, Sweden) and LEAR (CERN). Methods of the instability suppression, which allow increasing the cooled beam intensity, are described. This work is supported by RFBR grant no. 05-02-16320 and INTAS grant no. 03-54-5584.

  11. Acceleration of ampere class H(-) ion beam by MeV accelerator.

    PubMed

    Taniguchi, M; Inoue, T; Umeda, N; Kashiwagi, M; Watanabe, K; Tobari, H; Dairaku, M; Sakamoto, K

    2008-02-01

    The H(-) ion accelerator R&D to realize the international thermonuclear experimental reactor neutral beam is ongoing at Japan Atomic Energy Agency (JAEA). The required performance for the prototype MeV accelerator developed at JAEA is 1 MeV, 500 mA (current density of 200 A/m(2)) H(-) ion beam at the beamlet divergence angle of less than 7 mrad. Up to 2005, 836 keV, 146 A/m(2) H(-) ion beam was successfully accelerated as the highest record of the current density at MeV class energy beams. In the present work, high current negative ion beam acceleration test was performed by increasing the beam extraction apertures from 3 x 3 (9 apertures) to 3 x 5 (15 apertures). By fixing the air leak at the source chamber due to backstream ions as well as the improvement of voltage holding capability by a new fiber reinforced plastic insulator ring, the performance of the MeV accelerator was improved. So far, H(-) ion beam of 320 mA was successfully accelerated up to 796 keV with the beam divergence angle of 5.5 mrad. The accelerated drain current including the electron reaches close to the power supply limit for the MeV test facility. The heat flux by the backstream ion during the above beam acceleration was estimated to be 360 W/cm(2). The Cs leakage to the accelerator during the test campaign (Cs total input of 5.0 g) was 0.26 mg (7.0 microg/cm(2)). This is considered to be the allowable level from the viewpoint of voltage holding.

  12. Physics design of a 100 keV acceleration grid system for the diagnostic neutral beam for international tokamak experimental reactor

    SciTech Connect

    Singh, M. J.; De Esch, H. P. L.

    2010-01-15

    This paper describes the physics design of a 100 keV, 60 A H{sup -} accelerator for the diagnostic neutral beam (DNB) for international tokamak experimental reactor (ITER). The accelerator is a three grid system comprising of 1280 apertures, grouped in 16 groups with 80 apertures per beam group. Several computer codes have been used to optimize the design which follows the same philosophy as the ITER Design Description Document (DDD) 5.3 and the 1 MeV heating and current drive beam line [R. Hemsworth, H. Decamps, J. Graceffa, B. Schunke, M. Tanaka, M. Dremel, A. Tanga, H. P. L. De Esch, F. Geli, J. Milnes, T. Inoue, D. Marcuzzi, P. Sonato, and P. Zaccaria, Nucl. Fusion 49, 045006 (2009)]. The aperture shapes, intergrid distances, and the extractor voltage have been optimized to minimize the beamlet divergence. To suppress the acceleration of coextracted electrons, permanent magnets have been incorporated in the extraction grid, downstream of the cooling water channels. The electron power loads on the extractor and the grounded grids have been calculated assuming 1 coextracted electron per ion. The beamlet divergence is calculated to be 4 mrad. At present the design for the filter field of the RF based ion sources for ITER is not fixed, therefore a few configurations of the same have been considered. Their effect on the transmission of the electrons and beams through the accelerator has been studied. The OPERA-3D code has been used to estimate the aperture offset steering constant of the grounded grid and the extraction grid, the space charge interaction between the beamlets and the kerb design required to compensate for this interaction. All beamlets in the DNB must be focused to a single point in the duct, 20.665 m from the grounded grid, and the required geometrical aimings and aperture offsets have been calculated.

  13. Physics design of a 100 keV acceleration grid system for the diagnostic neutral beam for international tokamak experimental reactor

    NASA Astrophysics Data System (ADS)

    Singh, M. J.; De Esch, H. P. L.

    2010-01-01

    This paper describes the physics design of a 100 keV, 60 A H- accelerator for the diagnostic neutral beam (DNB) for international tokamak experimental reactor (ITER). The accelerator is a three grid system comprising of 1280 apertures, grouped in 16 groups with 80 apertures per beam group. Several computer codes have been used to optimize the design which follows the same philosophy as the ITER Design Description Document (DDD) 5.3 and the 1 MeV heating and current drive beam line [R. Hemsworth, H. Decamps, J. Graceffa, B. Schunke, M. Tanaka, M. Dremel, A. Tanga, H. P. L. De Esch, F. Geli, J. Milnes, T. Inoue, D. Marcuzzi, P. Sonato, and P. Zaccaria, Nucl. Fusion 49, 045006 (2009)]. The aperture shapes, intergrid distances, and the extractor voltage have been optimized to minimize the beamlet divergence. To suppress the acceleration of coextracted electrons, permanent magnets have been incorporated in the extraction grid, downstream of the cooling water channels. The electron power loads on the extractor and the grounded grids have been calculated assuming 1 coextracted electron per ion. The beamlet divergence is calculated to be 4 mrad. At present the design for the filter field of the RF based ion sources for ITER is not fixed, therefore a few configurations of the same have been considered. Their effect on the transmission of the electrons and beams through the accelerator has been studied. The OPERA-3D code has been used to estimate the aperture offset steering constant of the grounded grid and the extraction grid, the space charge interaction between the beamlets and the kerb design required to compensate for this interaction. All beamlets in the DNB must be focused to a single point in the duct, 20.665 m from the grounded grid, and the required geometrical aimings and aperture offsets have been calculated.

  14. Physics design of a 100 keV acceleration grid system for the diagnostic neutral beam for international tokamak experimental reactor.

    PubMed

    Singh, M J; De Esch, H P L

    2010-01-01

    This paper describes the physics design of a 100 keV, 60 A H(-) accelerator for the diagnostic neutral beam (DNB) for international tokamak experimental reactor (ITER). The accelerator is a three grid system comprising of 1280 apertures, grouped in 16 groups with 80 apertures per beam group. Several computer codes have been used to optimize the design which follows the same philosophy as the ITER Design Description Document (DDD) 5.3 and the 1 MeV heating and current drive beam line [R. Hemsworth, H. Decamps, J. Graceffa, B. Schunke, M. Tanaka, M. Dremel, A. Tanga, H. P. L. De Esch, F. Geli, J. Milnes, T. Inoue, D. Marcuzzi, P. Sonato, and P. Zaccaria, Nucl. Fusion 49, 045006 (2009)]. The aperture shapes, intergrid distances, and the extractor voltage have been optimized to minimize the beamlet divergence. To suppress the acceleration of coextracted electrons, permanent magnets have been incorporated in the extraction grid, downstream of the cooling water channels. The electron power loads on the extractor and the grounded grids have been calculated assuming 1 coextracted electron per ion. The beamlet divergence is calculated to be 4 mrad. At present the design for the filter field of the RF based ion sources for ITER is not fixed, therefore a few configurations of the same have been considered. Their effect on the transmission of the electrons and beams through the accelerator has been studied. The OPERA-3D code has been used to estimate the aperture offset steering constant of the grounded grid and the extraction grid, the space charge interaction between the beamlets and the kerb design required to compensate for this interaction. All beamlets in the DNB must be focused to a single point in the duct, 20.665 m from the grounded grid, and the required geometrical aimings and aperture offsets have been calculated.

  15. Ion-beam nano-patterning by using porous anodic alumina as a mask

    NASA Astrophysics Data System (ADS)

    Shin, S. W.; Lee, S. G.; Lee, J.; Whang, C. N.; Lee, J.-H.; Choi, I.-H.; Kim, T. G.; Song, J. H.

    2005-08-01

    Anodized aluminium oxide (AAO) with self-organized and ordered nano-hole arrays may be a good candidate for an irradiation mask to modify the properties of a nano-scale region. In order to use AAO as a mask for ion beam patterning, the ion beam transmittance of AAO should first be tested. In an AAO with a high aspect ratio (about 100), anodized from Al bulk foil, the ion beam transmittance was extremely low. However, when AAO with low aspect ratio (about 5), fabricated with thin film Al on SiO2, was irradiated with 80 keV Co ions, the Co ion transmittance was enormously improved. After selective etching of the unirradiated region, ion beam patterned 80 nm SiO2 dot arrays have been fabricated. This shows a potential of AAO with a low aspect ratio for an ion beam patterning nano-mask. In order to demonstrate the ion beam nano-patterning, magnetic nano-patterning was performed. A Co/Pt multilayer film with a perpendicular magnetic anisotropy was ion irradiated through an AAO mask with a low aspect ratio, 460 nm height and 50 nm diameter, and the magnetic properties were investigated by MOKE. The formation of a magnetic nano-pattern was confirmed by MFM.

  16. Study of the evolution of the metal surfaces topography under ion beam impact using statistic methods

    NASA Astrophysics Data System (ADS)

    Yashin, A. S.; Valikov, R. A.; Yakutkina, T. V.; Volkov, N. V.

    2015-11-01

    Evolution of the state of cladding tubes outer surface from zirconium E110 alloy during ion-beam treatment was investigated using statistic methods. The samples have been irradiated on specialized installation ILUR-03 be radial Ar+ beam with wide energetic spectrum.0.5-5.0 keV up to doses (5-10)×1018 ion cm-2. It is shown, that profile of the ion-modified surface may be descripted by means of autocorrelation function. Average relief roughnesses size increase after ion beam treatment is found. It is revealed that there are regular as well as random roughnesses at the surface investigated. It is established, that random component of relief, caused by mechanical abrasion, decreases during ion-treatment under given conditions.

  17. In-Situ atomic force microscopic observation of ion beam bombarded plant cell envelopes

    NASA Astrophysics Data System (ADS)

    Sangyuenyongpipat, S.; Yu, L. D.; Brown, I. G.; Seprom, C.; Vilaithong, T.

    2007-04-01

    A program in ion beam bioengineering has been established at Chiang Mai University (CMU), Thailand, and ion beam induced transfer of plasmid DNA molecules into bacterial cells (Escherichia coli) has been demonstrated. However, a good understanding of the fundamental physical processes involved is lacking. In parallel work, onion skin cells have been bombarded with Ar+ ions at energy 25 keV and fluence1-2 × 1015 ions/cm2, revealing the formation of microcrater-like structures on the cell wall that could serve as channels for the transfer of large macromolecules into the cell interior. An in-situ atomic force microscope (AFM) system has been designed and installed in the CMU bio-implantation facility as a tool for the observation of these microcraters during ion beam bombardment. Here we describe some of the features of the in-situ AFM and outline some of the related work.

  18. Preliminary Research Results for the Generation and Diagnostics of High Power Ion Beams on FLASH II Accelerator

    NASA Astrophysics Data System (ADS)

    Yang, Hailiang; Qiu, Aici; Sun, Jianfeng; He, Xiaoping; Tang, Junping; Wang, Haiyang; Li, Hongyu; Li, Jingya; Ren, Shuqing; Ouyang, Xiaoping; Zhang, Guoguang

    2004-12-01

    The preliminary experimental results of the generation and diagnostics of high-power ion beams of FLASH II accelerator are reported. The high-power ion beams presently are being produced in a pinched diode. The method for enhancing the ratio of ion to electron current is to increase the electron residing time by pinching the electron flow. Furthermore, electron beam pinching can be combined with electron reflexing to achieve ion beams with even higher efficiency and intensity. The anode plasma is generated by anode foil bombarded with electron and anode foil surface flashover. In recent experiments on FLASH II accelerator, ion beams have been produced with a current of 160 kA and an energy of 500 keV corresponding to an ion beam peak power of about 80 GW. The ion number and current of high power ion beams were determined by monitoring delayed radioactivity from nuclear reactions induced in a 12C target by the proton beams. The prompt γ-rays and diode bremsstrahlung x-rays were measured with a PIN semi-conductor detector and a plastic scintillator detector. The current density distribution of ion beam were measured with a biased ion collector array. The ion beams were also recorded with a CR-39 detector.

  19. Single impacts of keV fullerene ions on free standing graphene: Emission of ions and electrons from confined volume

    SciTech Connect

    Verkhoturov, Stanislav V.; Geng, Sheng; Schweikert, Emile A.; Czerwinski, Bartlomiej; Young, Amanda E.; Delcorte, Arnaud

    2015-10-28

    We present the first data from individual C{sub 60} impacting one to four layer graphene at 25 and 50 keV. Negative secondary ions and electrons emitted in transmission were recorded separately from each impact. The yields for C{sub n}{sup −} clusters are above 10% for n ≤ 4, they oscillate with electron affinities and decrease exponentially with n. The result can be explained with the aid of MD simulation as a post-collision process where sufficient vibrational energy is accumulated around the rim of the impact hole for sputtering of carbon clusters. The ionization probability can be estimated by comparing experimental yields of C{sub n}{sup −} with those of C{sub n}{sup 0} from MD simulation, where it increases exponentially with n. The ionization probability can be approximated with ejecta from a thermally excited (3700 K) rim damped by cluster fragmentation and electron detachment. The experimental electron probability distributions are Poisson-like. On average, three electrons of thermal energies are emitted per impact. The thermal excitation model invoked for C{sub n}{sup −} emission can also explain the emission of electrons. The interaction of C{sub 60} with graphene is fundamentally different from impacts on 3D targets. A key characteristic is the high degree of ionization of the ejecta.

  20. Charge Distribution of Kr Ions Produced Under 1.3 keV X-ray Irradiation

    NASA Astrophysics Data System (ADS)

    Elfimov, S. V.; Dorofeev, D. L.; Zon, B. A.; Chernov, V. E.

    2017-09-01

    Charge distribution of Kr ions produced under irradiation of neutral atoms by x-ray photons with energy of 1.3 keV is calculated by the Monte Carlo method in the model of the effective atomic potential. The calculated results are in good agreement with recent experimental data and can be used in the development and operation of gas detectors controlling the intensity of free-electron x-ray lasers.

  1. Dynamics of ion beam charge neutralization by ferroelectric plasma sources

    DOE PAGES

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; ...

    2016-04-27

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams, as has been demonstrated on the Neutralized Drift Compression Experiment NDCX-I and NDCX-II. This article presents experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a plasma produced in a FEPS discharge. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable with sufficiently dense FEPS plasma. The transverse electrostatic potential of the ion beam is reduced from 15V before neutralization to 0.3 V,more » implying that the energy of the neutralizing electrons is below 0.3 eV. Measurements of the time-evolution of beam radius show that near-complete charge neutralization is established similar to –5 μs after the driving pulse is applied to the FEPS and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub-mu s surface discharge. Measurements of current flow in the driving circuit of the FEPS show the existence of electron emission into vacuum, which lasts for tens of mu s after the high voltage pulse is applied. Lastly, it is argued that the beam is neutralized by the plasma produced by this process and not by a surface discharge plasma that is produced at the instant the high-voltage pulse is applied.« less

  2. Dynamics of ion beam charge neutralization by ferroelectric plasma sources

    SciTech Connect

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; Kaganovich, Igor D.; Davidson, Ronald C.

    2016-04-27

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams, as has been demonstrated on the Neutralized Drift Compression Experiment NDCX-I and NDCX-II. This article presents experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a plasma produced in a FEPS discharge. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable with sufficiently dense FEPS plasma. The transverse electrostatic potential of the ion beam is reduced from 15V before neutralization to 0.3 V, implying that the energy of the neutralizing electrons is below 0.3 eV. Measurements of the time-evolution of beam radius show that near-complete charge neutralization is established similar to –5 μs after the driving pulse is applied to the FEPS and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub-mu s surface discharge. Measurements of current flow in the driving circuit of the FEPS show the existence of electron emission into vacuum, which lasts for tens of mu s after the high voltage pulse is applied. Lastly, it is argued that the beam is neutralized by the plasma produced by this process and not by a surface discharge plasma that is produced at the instant the high-voltage pulse is applied.

  3. Dynamics of ion beam charge neutralization by ferroelectric plasma sources

    SciTech Connect

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; Kaganovich, Igor D.; Davidson, Ronald C.

    2016-04-27

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams, as has been demonstrated on the Neutralized Drift Compression Experiment NDCX-I and NDCX-II. This article presents experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a plasma produced in a FEPS discharge. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable with sufficiently dense FEPS plasma. The transverse electrostatic potential of the ion beam is reduced from 15V before neutralization to 0.3 V, implying that the energy of the neutralizing electrons is below 0.3 eV. Measurements of the time-evolution of beam radius show that near-complete charge neutralization is established similar to –5 μs after the driving pulse is applied to the FEPS and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub-mu s surface discharge. Measurements of current flow in the driving circuit of the FEPS show the existence of electron emission into vacuum, which lasts for tens of mu s after the high voltage pulse is applied. Lastly, it is argued that the beam is neutralized by the plasma produced by this process and not by a surface discharge plasma that is produced at the instant the high-voltage pulse is applied.

  4. Dynamics of ion beam charge neutralization by ferroelectric plasma sources

    NASA Astrophysics Data System (ADS)

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; Kaganovich, Igor D.; Davidson, Ronald C.

    2016-04-01

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams, as has been demonstrated on the Neutralized Drift Compression Experiment NDCX-I and NDCX-II. This article presents experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a plasma produced in a FEPS discharge. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable with sufficiently dense FEPS plasma. The transverse electrostatic potential of the ion beam is reduced from 15 V before neutralization to 0.3 V, implying that the energy of the neutralizing electrons is below 0.3 eV. Measurements of the time-evolution of beam radius show that near-complete charge neutralization is established ˜5 μs after the driving pulse is applied to the FEPS and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub-μs surface discharge. Measurements of current flow in the driving circuit of the FEPS show the existence of electron emission into vacuum, which lasts for tens of μs after the high voltage pulse is applied. It is argued that the beam is neutralized by the plasma produced by this process and not by a surface discharge plasma that is produced at the instant the high-voltage pulse is applied.

  5. Ion beam sputter etching and deposition of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Sovey, J. S.; Miller, T. B.; Crandall, K. S.

    1978-01-01

    Fluoropolymer etching and deposition techniques including thermal evaporation, RF sputtering, plasma polymerization, and ion beam sputtering are reviewed. Etching and deposition mechanism and material characteristics are discussed. Ion beam sputter etch rates for polytetrafluoroethylene (PTFE) were determined as a function of ion energy, current density and ion beam power density. Peel strengths were measured for epoxy bonds to various ion beam sputtered fluoropolymers. Coefficients of static and dynamic friction were measured for fluoropolymers deposited from ion bombarded PTFE.

  6. Ion beam sputter etching and deposition of fluoropolymers

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Sovey, J. S.; Miller, T. B.; Crandall, K. S.

    1978-01-01

    Fluoropolymer etching and deposition techniques including thermal evaporation, RF sputtering, plasma polymerization, and ion beam sputtering are reviewed. Etching and deposition mechanisms and material characteristics are discussed. Ion beam sputter etch rates for polytetrafluoroethylene (PTFE) were determined as a function of ion energy, current density and ion beam power density. Peel strengths were measured for epoxy bonds to various ion beam sputtered fluoropolymers. Coefficients of static and dynamic friction were measured for fluoropolymers deposited from ion bombarded PTFE.

  7. Producing metastable nanophase with sharp interface by means of focused ion beam irradiation

    NASA Astrophysics Data System (ADS)

    Barna, Árpád; Kotis, László; Lábár, János; Osváth, Zoltán; Tóth, Attila L.; Menyhárd, Miklós; Zalar, Anton; Panjan, Peter

    2009-02-01

    Amorphous carbon/nickel double layers were irradiated by 30 keV Ga+ ions via focused ion beam. The effect of irradiation on the concentration distribution of all constituents was studied by Auger electron spectroscopy depth profiling and cross sectional transmission electron microscopy, while the morphology change of the sample was determined by atomic force microscopy. The Ga+ ion irradiation results in the formation of metastable Ni3C layer with a uniform thickness. The C/Ni3C and Ni3C/Ni interfaces were found to be sharp up to a fluence of 200 Ga+ ions/nm2.

  8. Rhenium ion beam for implantation into semiconductors

    SciTech Connect

    Kulevoy, T. V.; Seleznev, D. N.; Alyoshin, M. E.; Kraevsky, S. V.; Yakushin, P. E.; Khoroshilov, V. V.; Gerasimenko, N. N.; Smirnov, D. I.; Fedorov, P. A.; Temirov, A. A.

    2012-02-15

    At the ion source test bench in Institute for Theoretical and Experimental Physics the program of ion source development for semiconductor industry is in progress. In framework of the program the Metal Vapor Vacuum Arc ion source for germanium and rhenium ion beam generation was developed and investigated. It was shown that at special conditions of ion beam implantation it is possible to fabricate not only homogenous layers of rhenium silicides solid solutions but also clusters of this compound with properties of quantum dots. At the present moment the compound is very interesting for semiconductor industry, especially for nanoelectronics and nanophotonics, but there is no very developed technology for production of nanostructures (for example quantum sized structures) with required parameters. The results of materials synthesis and exploration are presented.

  9. Surface processing using water cluster ion beams

    NASA Astrophysics Data System (ADS)

    Takaoka, Gikan H.; Ryuto, Hiromichi; Takeuchi, Mitsuaki; Ichihashi, Gaku

    2013-07-01

    Vaporized water clusters were produced by an adiabatic expansion phenomenon, and various substrates such as Si(1 0 0), SiO2, polymethyl methacrylate (PMMA), polyethylene terephthalate (PET), and polycarbonate (PC) were irradiated by water cluster ion beams. The sputtered depth increased with increasing acceleration voltage, and the sputtering rate was much larger than that obtained using Ar monomer ion irradiation. The sputtering yield for PMMA was approximately 200 molecules per ion, at an acceleration voltage of 9 kV. X-ray photoelectron spectroscopy (XPS) measurements showed that high-rate sputtering for the PMMA surface can be ascribed to the surface erosion by the water cluster ion irradiation. Furthermore, the micropatterning was demonstrated on the PMMA substrate. Thus, the surface irradiation by water cluster ion beams exhibited a chemical reaction based on OH radicals, as well as excited hydrogen atoms, which resulted in a high sputtering rate and low irradiation damage of the substrate surfaces.

  10. Comparison of measured parameters from a 24-keV and a broad spectrum epithermal neutron beam for neutron capture therapy: an identification of consequential parameters.

    PubMed

    Fairchild, R G; Saraf, S K; Kalef-Ezra, J; Laster, B H

    1990-01-01

    Epithermal neutron beams are under development in a number of locations in the U.S. and abroad. The increased penetration in tissue provided by these neurons should circumvent problems associated with the rapid attenuation of thermal neutron beams encountered in previous clinical trials of neutron capture therapy (NCT). Physical and radiobiological experiments with two "intermediate energy" or "epithermal" beams have been reported. A comparison is made here between the 24-keV iron-filtered beam at Harwell, England, and the broad-spectrum Al2 O3 moderated beam at the Brookhaven Medical Research Reactor (BMRR). In addition, parameters which are relevant for NCT, and which are best suited for evaluation and comparison of beams, are discussed. Particular attention is paid to the mean neutron energy which can be tolerated without significant reduction of therapeutic gain (TG), where TG is the ratio of tumor dose to maximum normal tissue dose. It is suggested that the simplest and most meaningful parameters for comparison of beam intensity and purity are the epithermal neutron fluence rate, and the fast neutron dose per epithermal neutron (4.2 X 10(-11) rad/neutron for the broad-spectrum beam and 29 X 10(-11) rad/neutron for the 24-keV beam). While the Al2O3 beam is close to optimal, the 24-keV beam produces a significant fast neutron dose which results in a lower TG.(ABSTRACT TRUNCATED AT 250 WORDS)

  11. Secondary Electron Generation by Low Energy Ion Beams

    SciTech Connect

    Joy, David Charles; Lin, Yinghong; Meyer III, Harry M; Demers, Hendrix; Newbury, Dale

    2006-01-01

    Low energy ion beams are being increasingly viewed as an alternative to, or even as areplacement for, low voltage SEMs. The beam interaction volumes in both cases are comparable in their size and their proximity to the sample surface, and both can produce high quality secondary electron images. However, although a cursory comparison of ion generated SE (iSE) and electron generated SE (eSE) images of the same area of a sample shows micrographs that can look very similar this is misleading because the nature of the iSE and eSE images are quite distinct. More experimental data and additional analysis of the beam interactions is therefore required if images are to be properly nterpreted.The yield de of eSE, rises rapidly with incident beam energy E reaching a maximum value which is typically in the range 1.5-2 and occurs at an energy of a few hundred eV before then falling away as about 1/E.. In the case of ion beam irradiation the kinetic production of iSE commences at a particle velocity of about 107cm/sec 30eV for He, (3keV for Ar) producing a yield di of iSE which rises almost linearly with the accelerating voltage and reaches typical values of 1.5 - 2.5 for energies of the order of 20- 30kV. Thus while at low energies the eSE and iSE yields are comparable in magnitude, at higher energies the iSE yield is an order of magnitude or more larger. The iSE yield will eventually each a maximum value and then begin to fall when once the interaction volume lies mostly below the escape depth of the SE. Both eSE and iSE yields also display a marked - although apparently chaotic - dependence on the atomic number of the target (Z2) and, in the ion case, on the atomic number of the ion (Z1) itself. In the electron case the minima in the SE yield versus Z2 plot correspond to shell filling but there is presently insufficient evidence to confirm if the same is true for the ion SE case. Because the stopping powers of ion and electrons, and hence their range in a given material, are

  12. Extracted beam and electrode currents in the inductively driven surface-plasma negative hydrogen ion source

    NASA Astrophysics Data System (ADS)

    Belchenko, Yu.; Ivanov, A.; Sanin, A.; Sotnikov, O.

    2017-08-01

    The data on long-pulsed operation of RF surface-plasma source is presented. The source regularly produces the H- ion beam with current >1A, energy ≥90 keV and pulse duration ≥2 s. The total H- beam curent, transported to the distant Faraday cup and the currents in the circuits of ion-optical system elements were measured. The composition of accelerated and extracted grid currents was clarified. The relatively high level of acceleration grid current 0.4 A was observed. It consists mainly of secondary electrons, emitted from extraction grid apertures and stripped from H- ions and could be decreased by optimization of positive PG bias applied. The test stand experiments on beam transport through the LEBT were carried out. About 90% of the H- ion beam was transported from the source to the distant calorimeter plane. The full size of 93 keV beam, transported to the calorimeter plane, was larger, than the size of the calorimeter inlet window. As a result, ˜ 60% of the initial beam power was registered by the calorimeter with window 24×24 cm2.

  13. Numerical simulation of ion rings and ion beam propagation

    NASA Astrophysics Data System (ADS)

    Manofsky, A.

    The development of numerical simulation techniques for studying the physics of ion beams and rings in a background plasma as applicable to certain problems in magnetic and inertial confinement fusion is presented. Two codes were developed for these purposes: RINGA and CIDER. The 2 and 1/2 dimensional particle code RINGA follows the trajectories of ions in their self consistent magnetic field. The code assumes strict charge neutrality and admits currents only in the azimuthal direction. The injection and resistive trapping of ion rings was with RINGA. Modifications to RINGA to include finite pressure of confined plasma and beam ion electron slowing down collisions are discussed. In the CIDER hybrid code, ions are represented by particles and electrons by an inertialess thermal fluid which obeys a generalized Ohm's law. Fields are solved in the quasineutral Darwin approximation. Several collisional and atomic processes are included.

  14. Observation of the emission of positive and negative ions in triple and quadruple collisions in a solid under bombardment with keV argon ions

    NASA Astrophysics Data System (ADS)

    Babenko, P. Yu.; Shergin, A. P.

    2006-12-01

    Particles that leave a solid as a result of several consecutive binary collisions are detected in the energy spectra of positive and negative ions emitted upon the irradiation of C, Si, Ge, and In targets with 2-to 5-keV Ar+ ions. The appearance of a spectral structure due to the sequence of three and four collisions in the solid can be attributed to the selective role of the surface, which is similar to the channeling effect in crystals.

  15. Low-energy ion beam bombardment effect on the plant-cell-envelope mimetic membrane for DNA transfer

    NASA Astrophysics Data System (ADS)

    Prakrajang, K.; Sangwijit, K.; Anuntalabhochai, S.; Wanichapichart, P.; Yu, L. D.

    2012-09-01

    This study is a systematic analysis of the mechanisms involved in ion-beam induced DNA transfer, an important application of ion beam biotechnology. Cellulose membranes were used to mimic the plant cell envelope. Ion beams of argon (Ar) or nitrogen (N) at an energy of 25 keV bombarded the cellulose membranes at fluences ranging from 1015 to 1016 ions/cm2. The damage to the ion-beam-bombarded membranes was characterized using infrared spectroscopy, a micro tensile test and scanning electron microscopy (SEM). Chain scission was the dominant radiation damage type in the membrane. DNA diffusion across the membrane was significantly increased after ion beam bombardment. The increase in DNA transfer is therefore attributed to chain scission, which increases the permeability by increasing the number of pores in the membrane.

  16. Neutral Beam Ion Loss Modeling for NSTX

    SciTech Connect

    D. Mikkelsen; D.S. Darrow; L. Grisham; R. Akers; S. Kaye

    1999-06-01

    A numerical model, EIGOL, has been developed to calculate the loss rate of neutral beam ions from NSTX and the resultant power density on the plasma facing components. This model follows the full gyro-orbit of the beam ions, which can be a significant fraction of the minor radius. It also includes the three-dimensional structure of the plasma facing components inside NSTX. Beam ion losses from two plasma conditions have been compared: {beta} = 23%, q{sub 0} = 0.8, and {beta} = 40%, q{sub 0} = 2.6. Global losses are computed to be 4% and 19%, respectively, and the power density on the rf antenna is near the maximum tolerable levels in the latter case.

  17. Radiotherapy with beams of carbon ions

    NASA Astrophysics Data System (ADS)

    Amaldi, Ugo; Kraft, Gerhard

    2005-08-01

    In cancer treatment, the introduction of MeV bremsstrahlung photons has been instrumental in delivering higher doses to deep-seated tumours, while reducing the doses absorbed by the surrounding healthy tissues. Beams of protons and carbon ions have a much more favourable dose-depth distribution than photons (called 'x-rays' by medical doctors) and are the new frontiers of cancer radiation therapy. Section 2 presents the status of the first form of hadrontherapy which uses beams of 200-250 MeV protons. The central part of this review is devoted to the discussion of the physical, radiobiological and clinical bases of the use of 400 MeV µ-1 carbon ions in the treatment of radio-resistant tumours. These resist irradiation with photon as well as proton beams. The following section describes the carbon ion facilities that are either running or under construction. Finally, the projects recently approved or proposed are reviewed here.

  18. Ion beam and laser induced surface modifications

    NASA Astrophysics Data System (ADS)

    Appleton, B. R.

    1984-01-01

    The capabilities of energetic ion beam and laser processing of surfaces are reviewed. Ion implantation doping, ion beam mixing, and laser and electron beam processing techniques are capable of producing new and often unique surface properties. The inherent control of these techniques has led to significant advances in our ability to tailor the properties of solids for a wide range of technological applications. Equally important, these techniques have allowed tests of fundamental materials interactions under conditions not heretofore achievable and have resulted in increased understanding of a broad range of materials phenomena. These include new metastable phase formation, rapid nucleation and crystal growth kinetics, amorphous metals and metaglasses, supersaturated solid solutions and substitutional alloys, interface interactions, solute trapping, laser-assisted chemical modifications, and a host of other.

  19. Scanning He+ Ion Beam Microscopy and Metrology

    SciTech Connect

    Joy, David C.

    2011-11-10

    The CD-SEM has been the tool of choice for the imaging and metrology of semiconductor devices for the past three decades but now, with critical dimensions at the nanometer scale, electron beam instruments can no longer deliver adequate performance. A scanning microscope using a He+ ion beam offers superior resolution and depth of field, and provides enhanced imaging contrast. Device metrology performed using ion beam imaging produces data which is comparable to or better than that from a conventional CD-SEM although there are significant differences in the experimental conditions required and in the details of image formation. The charging generated by a He+ beam, and the sample damage that it can cause, require care in operation but are not major problems.

  20. Development of an external beam ion milliprobe

    NASA Astrophysics Data System (ADS)

    MacLaren, Stephan A.

    1990-05-01

    The goals of this Trident Project were the design, construction, testing, and initial application of an external beam ion milliprobe. The ion milliprobe is a tool for elemental analysis that employs the 1.7 million volt tandem electrostatic accelerator in Michelson C-7 to provide a beam of charged particles. The mechanism used for the analysis of elemental concentration is particle induced x ray emission (PIXE). This technique involves detecting and counting the x rays produced when the focused beam of charged particles strikes the sample to be analyzed. The design and construction of several essential specialized devices is described including an electrostatic quadrupole triplet lens, a current measuring collimator, an exit tip, and a sample enclosure. The procedures necessary to align, focus, and determine the size of the beam are discussed. Finally, the results of the initial analysis are evaluated and presented.

  1. Fabricating high-density magnetic storage elements by low-dose ion beam irradiation

    SciTech Connect

    Neb, R.; Sebastian, T.; Pirro, P.; Hillebrands, B.; Pofahl, S.; Schaefer, R.; Reuscher, B.

    2012-09-10

    We fabricate magnetic storage elements by irradiating an antiferromagnetically coupled ferromagnetic/nonmagnetic/ferromagnetic trilayer by a low-dose ion beam. The irradiated areas become ferromagnetically coupled and are capable of storing information if their size is small enough. We employ Fe/Cr/Fe trilayers and a 30 keV focused Ga{sup +}-ion beam to demonstrate the working principle for a storage array with a bit density of 7 Gbit/in.{sup 2}. Micromagnetic simulations suggest that bit densities of at least two magnitudes of order larger should be possible.

  2. Beam Energy Scaling on Ion-Induced Electron Yield from K+ Impacton Stainless Steel

    SciTech Connect

    Kireeff Covo, Michel; Molvik, Arthur; Friedman, Alex; Westenskow,Glen; Barnard, John J.; Cohen, Ronald; Grote, David; Lund, Steven M.; Seidl, Peter; Kwan, Joe W.; Logan, Grant; Baca, David; Bieniosek, Frank; Celata, Christine M.; Vay Jean-Luc; Vujic, Jasmina L.

    2006-01-01

    Electron clouds limit the performance of many major accelerators. Significant quantities of electrons result when halo ions are lost to beam tubes, generating gas which can be ionized and ion-induced electrons that can multiply and accumulate, causing degradation or loss of the ion beam. In order to understand the physical mechanisms of ion-induced electron production, experiments studied the impact of 50 to 400 keV K{sup +} ions on stainless steel surfaces near grazing incidence, using the 500 kilovolts Ion Source Test Stand (STS-500) at LLNL. The experimental electron yield scales with the electronic component (dE{sub e}/dx) of the stopping power. A theoretical model is developed, using TRIM code to evaluate dE{sub e}/dx at several depths in the target, to estimate the electron yield, which is compared with the experimental results.

  3. Focused-Ion-Beam Material Removal Rates

    DTIC Science & Technology

    1993-09-01

    AD-A270 852 SIll II 111111111 lillI I ARMY RESEARCH LABORATORY Focused -Ion-Beam Material Removal Rates by Bruce GeOl ARL-MR-1 14 September 1993 93...DATES COVERED September 1993 Summary, January 1991-present 4. TITLE AND SUBTITLE 5. FUNDING NUMBERS Focused -Ion-Beam Material Removal Rates PE: 91A 6...AUTHOR( S ) Bruce Geil 7. PERFORMING ORGANIZATION NAME( S ) AND ADDRESS(ES) 8. PERFORMING ORGANIZATION U.S. Army Research Laboratory REPORT NUMBER Attn

  4. X-ray emission study of ion beam mixed Cu/Al films on polyimide

    SciTech Connect

    Kurmaev, E.Z.; Zatsepin, D.A.; Winarski, R.P.; Stadler, S.; Ederer, D.L.; Moewes, A.; Fedorenko, V.V.; Shamin, S.N.; Galakhov, V.R.; Chang, G.S.; Whang, C.N.

    1999-03-01

    Cu (40 nm)/Al/polyimide/Si was mixed with 80 keV Ar{sup +} and N{sub 2}{sup +} from 5.0{times}10{sup 15} to 15{times}10{sup 15} ions/cm{sup 2}. Ultrasoft x-ray emission valence spectra (XES) of Cu, C, N and O excited by electron and photon radiation were used for study of chemical reactions in Cu/Al/PI/Si and PI/Si systems induced by ion beam mixing in dependence of type of ions and dose. It is found that ion beam mixing changes the chemical state of Cu atoms with respect to that of pure metal. These changes depend on the dose of ion beam bombardment and type of ions and are attributed to a formation of CuAl{sub 2}O{sub 4} interfacial layer, which can be responsible for enhanced interfacial adhesion strength. On the other hand, it is shown that the shape of C {ital K}{alpha}, N {ital K}{alpha} and O {ital K}{alpha} XES of ion beam mixed polyimide layer (PI/Si) is modified with ion bombardment. This means that the ion-beam mixing process is able to break the bonding of constituent atoms of irradiated PI layers and can induce the formation of chemically bonded complexes linking atoms in the Cu, Al and PI layers.{copyright} {ital 1999 American Vacuum Society.}

  5. Overview of Light-Ion Beam Therapy

    SciTech Connect

    Chu, William T.

    2006-03-16

    In 1930, Ernest Orlando Lawrence at the University of California at Berkeley invented the cyclotron. One of his students, M. Stanley Livingston, constructed a 13-cm diameter model that had all the features of early cyclotrons, accelerating protons to 80 keV using less than 1 kV on a semi-circular accelerating electrode, now called the ''dee''. Soon after, Lawrence constructed the first two-dee 27-Inch (69-cm) Cyclotron, which produced protons and deuterons of 4.8 MeV. In 1939, Lawrence constructed the 60-Inch (150-cm) Cyclotron, which accelerated deuterons to 19 MeV. Just before WWII, Lawrence designed a 184-inch cyclotron, but the war prevented the building of this machine. Immediately after the war ended, the Veksler-McMillan principle of phase stability was put forward, which enabled the transformation of conventional cyclotrons to successful synchrocyclotrons. When completed, the 184-Inch Synchrocyclotron produced 340-MeV protons. Following it, more modern synchrocyclotrons were built around the globe, and the synchrocyclotrons in Berkeley and Uppsala, together with the Harvard cyclotron, would perform pioneering work in treatment of human cancer using accelerated hadrons (protons and light ions). When the 184-Inch Synchrocyclotron was built, Lawrence asked Robert Wilson, one of his former graduate students, to look into the shielding requirements for of the new accelerator. Wilson soon realized that the 184-Inch would produce a copious number of protons and other light ions that had enough energy to penetrate human body, and could be used for treatment of deep-seated diseases. Realizing the advantages of delivering a larger dose in the Bragg peak when placed inside deep-seated tumors, he published in a medical journal a seminal paper on the rationale to use accelerated protons and light ions for treatment of human cancer. The precise dose localization provided by protons and light ions means lower doses to normal tissues adjacent to the treatment volume

  6. Dynamics of the ion-ion acoustic instability in the thermalization of ion beams

    SciTech Connect

    Han, J.H.; Horton, W.; Leboeuf, J.N.

    1992-07-01

    Particle simulation using a nonlinear adiabatic electron response with two streaming ion species and nonlinear theory are used to study the collisionless thermalization of ion beams in a hot electron plasma. The slow beam or subsonic regime is investigated and the criterion for the transition from predominantly light ion to predominantly heavy ion heating is developed. Long-lived ion hole structures a-re observed in the final state.

  7. Dynamics of Ion Beam Charge Neutralization by Ferroelectric Plasma Sources

    NASA Astrophysics Data System (ADS)

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; Kaganovich, Igor D.; Davidson, Ronald C.; Ji, Qing; Persaud, Arun; Seidl, Peter A.; Schenkel, Thomas

    2016-10-01

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams. Here we present experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a FEPS plasma. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable. The transverse electrostatic potential of the ion beam is reduced from 15 V before neutralization to 0.3 V, implying that the energy of the neutralizing electrons is below 0.3 eV. Near-complete charge neutralization is established 5 μs after the driving pulse is applied to the FEPS, and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub- μs surface discharge. Measurements of current flow in the driving circuit of the FEPS suggest that plasma can be generated for tens of μs after the high voltage pulse is applied. This is confirmed by fast photography of the plasma in the 1-meter long FEPS on NDCX-II, where effective charge neutralization of the beam was achieved with the optimized FEPS timing. This work was supported by the Office of Science of the US Department of Energy under contracts DE-AC0209CH11466 (PPPL) and DE-AC0205CH11231 (LBNL).

  8. Ion beam sculpting molecular scale devices

    NASA Astrophysics Data System (ADS)

    Stein, Derek Martin

    We envision solid-state nanopores at the heart of a device capable of detecting, manipulating, and ultimately sequencing individual DNA molecules. To reliably fabricate holes whose diameter is commensurate with that of the DNA molecule (˜2nm), low energy ion beams are employed to tailor the size of holes in solid-state membranes by a new technique we call "ion beam sculpting". The transmission rate of ions through the hole is monitored to provide a direct, real-time measure of the hole area that is used as a feedback signal to trigger the termination of the ion irradiation process when the desired hole size is obtained. The sensitivity of the transmitted ion count rate to atomic-scale material rearrangements at the perimeter of a hole led to a surprising discovery: Low-energy ion beams stimulate the lateral transport of matter when incident on a surface, resulting in the growth of a thin film from the boundary of a hole that closes the hole. The net flow of matter is determined by a competition between sputter erosion, which opens the hole, and a hole closing process that dominates at high temperature and low flux. The timescale for lateral matter transport under ion irradiation is surprisingly long---on the order of a second. Two physical models are proposed to account for the surprising ion-stimulated transport of matter. One model is based on the viscous flow of a stressed surface layer, while the other is based on the diffusion of mobile, ion-stimulated species at the surface of the material into the hole. The predictions of the latter are compared to ion beam sculpting experiments. We exploit ion beam sculpting to fabricate solid-state nanopores used as electronic detectors of individual DNA molecules. In ionic solution, negatively charged DNA molecules are drawn to the nanopore by an applied electrochemical potential, resulting in a detectable characteristic ionic current blockade when a molecules occludes the nanopore. The applicability of the ion sculpting

  9. High-powered pulsed-ion-beam acceleration and transport

    SciTech Connect

    Humphries, S. Jr.; Lockner, T.R.

    1981-11-01

    The state of research on intense ion beam acceleration and transport is reviewed. The limitations imposed on ion beam transport by space charge effects and methods available for neutralization are summarized. The general problem of ion beam neutralization in regions free of applied electric fields is treated. The physics of acceleration gaps is described. Finally, experiments on multi-stage ion acceleration are summarized.

  10. Beam Control for Ion Induction Accelerators

    SciTech Connect

    Sangster, T.C.; Ahle, L.

    2000-02-17

    Coordinated bending and acceleration of an intense space-charge-dominated ion beam has been achieved for the first time. This required the development of a variable waveform, precision, bi-polar high voltage pulser and a precision, high repetition rate induction core modulator. Waveforms applied to the induction cores accelerate the beam as the bi-polar high voltage pulser delivers a voltage ramp to electrostatic dipoles which bend the beam through a 90 degree permanent magnet quadrupole lattice. Further work on emittance minimization is also reported.

  11. A subnanosecond pulsed ion source for micrometer focused ion beams.

    PubMed

    Höhr, C; Fischer, D; Moshammer, R; Dorn, A; Ullrich, J

    2008-05-01

    A new, compact design of an ion source delivers nanosecond pulsed ion beams with low emittance, which can be focused to micrometer size. By using a high-power, 25 fs laser pulse focused into a gas region of 10(-6) mbar, ions at very low temperatures are produced in the small laser focal volume of 5 mum diameter by 20 mum length through multiphoton ionization. These ions are created in a cold environment, not in a hot plasma, and, since the ionization process itself does not significantly heat them, have as a result essentially room temperature. The generated ion pulse, up to several thousand ions per pulse, is extracted from the source volume with ion optical elements that have been carefully designed by simulation calculations. Externally triggered, its subnanosecond duration and even smaller time jitter allow it to be superimposed with other pulsed particle or laser beams. It therefore can be combined with any type of collision experiment where the size and the time structure of the projectile beam crucially affect the achievable experimental resolution.

  12. Beam dynamics in heavy ion fusion

    SciTech Connect

    Seidl, P.

    1995-04-01

    A standard design for heavy ion fusion drivers under study in the US is an induction linac with electrostatic focusing at low energy and magnetic focusing at higher energy. The need to focus the intense beam to a few-millimeter size spot at the deuterium-tritium target establishes the emittance budget for the accelerator. Economic and technological considerations favor a larger number of beams in the low-energy, electrostatic-focusing section than in the high-energy, magnetic-focusing section. Combining four beams into a single focusing channel is a viable option, depending on the growth in emittance due to the combining process. Several significant beam dynamics issues that are, or have been, under active study are discussed: large space charge and image forces, beam wall clearances, halos, alignment, longitudinal instability, and bunch length control.

  13. Kinetic Simulations of Ion Beam Neutralization

    SciTech Connect

    Chang, O.; Wang, J.

    2011-05-20

    Full particle PIC simulations are performed to study the neutralization of an ion beam in the cohesionless, mesothermal regime. Simulations further confirmed that neutralization is achieved through interactions between the trapped electrons and the potential well established by the propagation of the beam front along the beam direction and is not through plasma instabilities as previous studies suggested. In the transverse direction, the process is similar to that of the expansion of mesothermal plasma into vacuum. Parametric simulations are also performed to investigate the effects of beam radius and domain boundary condition on the neutralization process. The results suggests that, while the qualitative behavior may be similar in ground tests, quantitative parameters such as the beam potential will be affected significantly by the vacuum chamber because of the limits imposed on the expansion process by the finite chamber space.

  14. SU-E-T-46: A Monte Carlo Investigation of Radiation Interactions with Gold Nanoparticles in Water for 6 MV, 85 KeV and 40 KeV Photon Beams

    SciTech Connect

    Flint, D B; O’Brien, D J; McFadden, C H; Wolfe, T; Krishnan, S; Sawakuchi, G O; Hallacy, T M

    2015-06-15

    Purpose: To determine the effect of gold-nanoparticles (AuNPs) on energy deposition in water for different irradiation conditions. Methods: TOPAS version B12 Monte Carlo code was used to simulate energy deposition in water from monoenergetic 40 keV and 85 keV photon beams and a 6 MV Varian Clinac photon beam (IAEA phase space file, 10x10 cm{sup 2}, SSD 100 cm). For the 40 and 85 keV beams, monoenergetic 2x2 mm{sup 2} parallel beams were used to irradiate a 30x30x10 µm {sup 3} water mini-phantom located at 1.5 cm depth in a 30x30x50 cm{sup 3} water phantom. 5000 AuNPs of 50 nm diameter were randomly distributed inside the mini-phantom. Energy deposition was scored in the mini-phantom with the AuNPs’ material set to gold and then water. For the 6 MV beam, we created another phase space (PHSP) file on the surface of a 2 mm diameter sphere located at 1.5 cm depth in the water phantom. The PHSP file consisted of all particles entering the sphere including backscattered particles. Simulations were then performed using the new PHSP as the source with the mini-phantom centered in a 2 mm diameter water sphere in vacuum. The g4em-livermore reference list was used with “EMRangeMin/EMRangeMax = 100 eV/7 MeV” and “SetProductionCutLowerEdge = 990 eV” to create the new PHSP, and “SetProductionCutLowerEdge = 100 eV” for the mini-phantom simulations. All other parameters were set as defaults (“finalRange = 100 µm”). Results: The addition of AuNPs resulted in an increase in the mini-phantom energy deposition of (7.5 ± 8.7)%, (1.6 ± 8.2)%, and (−0.6 ± 1.1)% for 40 keV, 85 keV and 6 MV beams respectively. Conclusion: Enhanced energy deposition was seen at low photon energies, but decreased with increasing energy. No enhancement was observed for the 6 MV beam. Future work is required to decrease the statistical uncertainties in the simulations. This research is partially supported from institutional funds from the Center for Radiation Oncology Research, The

  15. Irradiation Effect of keV Region Electron Beam on Bleaching and Cracking of Various Types of Sapphires

    NASA Astrophysics Data System (ADS)

    Lee, Bo-Hyun; Teraji, Tokuyuki; Ito, Toshimichi

    Various types of single-crystalline α-Al2O3 have been investigated on bleaching and cracking effects of keV electron beams using scanning electron microscope (SEM) and cathodoluminescence (CL) measurements. These electron-irradiation-induced effects observed at room temperature were different among four types of sapphires examined, namely, Be-diffusion-treated natural, untreated natural, synthetic orange, and synthetic red sapphires. The bleaching phenomenon occurred at electron dosages and the surface cracking phenomenon was subsequently observed at substantially higher dosages. The former was reversible so that an appropriate annealing in an oxygen atmosphere completely removed the bleached areas whereas the latter was a permanent change in structure that was not able to be recovered at all by such a treatment. It is found from these evidences that the crystalline quality of each specimen was well correlated with its beam-dose dependences of the electron-beam-induced phenomena observed. It should be noted that such electron-induced effects were almost completely reduced by the presence of a thin conductive layer on the insulating specimen surfaces.

  16. Using neutral beams as a light ion beam probe (invited)

    DOE PAGES

    Chen, Xi; Heidbrink, William W.; Van Zeeland, Michael A.; ...

    2014-08-05

    By arranging the particle first banana orbits to pass near a distant detector, the light ion beam probe (LIBP) utilizes orbital deflection to probe internal fields and field fluctuations. The LIBP technique takes advantage of 1) the in situ, known source of fast ions created by beam-injected neutral particles that naturally ionize near the plasma edge, and 2) various commonly available diagnostics as its detector. These born trapped particles can traverse the plasma core on their inner banana leg before returning to the plasma edge. Orbital displacements (the forces on fast ions) caused by internal instabilities or edge perturbing fieldsmore » appear as modulated signal at an edge detector. Adjustments in the q-profile and plasma shape that determine the first orbit, as well as the relative position of the source and detector, enable studies under a wide variety of plasma conditions. This diagnostic technique can be used to probe the impact on fast ions of various instabilities, e.g. Alfvén eigenmodes (AEs) and neoclassical tearing modes, and of externally-imposed 3D fields, e.g. magnetic perturbations. To date, displacements by AEs and by externally applied resonant magnetic perturbation fields have been measured using a fast ion loss detector. Comparisons with simulations are shown. Additionally, nonlinear interactions between fast ions and independent AE waves are revealed by this technique.« less

  17. Using neutral beams as a light ion beam probe (invited)

    SciTech Connect

    Chen, Xi; Heidbrink, William W.; Van Zeeland, Michael A.; Kramer, Gerrit J.; Pace, David C.; Petty, Craig C.; Austin, Max E.; Fisher, Raymond K.; Hanson, Jeremy M.; Nazikian, Raffi; Zeng, L.

    2014-08-05

    By arranging the particle first banana orbits to pass near a distant detector, the light ion beam probe (LIBP) utilizes orbital deflection to probe internal fields and field fluctuations. The LIBP technique takes advantage of 1) the in situ, known source of fast ions created by beam-injected neutral particles that naturally ionize near the plasma edge, and 2) various commonly available diagnostics as its detector. These born trapped particles can traverse the plasma core on their inner banana leg before returning to the plasma edge. Orbital displacements (the forces on fast ions) caused by internal instabilities or edge perturbing fields appear as modulated signal at an edge detector. Adjustments in the q-profile and plasma shape that determine the first orbit, as well as the relative position of the source and detector, enable studies under a wide variety of plasma conditions. This diagnostic technique can be used to probe the impact on fast ions of various instabilities, e.g. Alfvén eigenmodes (AEs) and neoclassical tearing modes, and of externally-imposed 3D fields, e.g. magnetic perturbations. To date, displacements by AEs and by externally applied resonant magnetic perturbation fields have been measured using a fast ion loss detector. Comparisons with simulations are shown. Additionally, nonlinear interactions between fast ions and independent AE waves are revealed by this technique.

  18. Using neutral beams as a light ion beam probe (invited)

    SciTech Connect

    Chen, Xi; Heidbrink, W. W.; Van Zeeland, M. A.; Pace, D. C.; Petty, C. C.; Fisher, R. K.; Kramer, G. J.; Nazikian, R.; Austin, M. E.; Hanson, J. M.; Zeng, L.

    2014-11-15

    By arranging the particle first banana orbits to pass near a distant detector, the light ion beam probe (LIBP) utilizes orbital deflection to probe internal fields and field fluctuations. The LIBP technique takes advantage of (1) the in situ, known source of fast ions created by beam-injected neutral particles that naturally ionize near the plasma edge and (2) various commonly available diagnostics as its detector. These born trapped particles can traverse the plasma core on their inner banana leg before returning to the plasma edge. Orbital displacements (the forces on fast ions) caused by internal instabilities or edge perturbing fields appear as modulated signal at an edge detector. Adjustments in the q-profile and plasma shape that determine the first orbit, as well as the relative position of the source and detector, enable studies under a wide variety of plasma conditions. This diagnostic technique can be used to probe the impact on fast ions of various instabilities, e.g., Alfvén eigenmodes (AEs) and neoclassical tearing modes, and of externally imposed 3D fields, e.g., magnetic perturbations. To date, displacements by AEs and by externally applied resonant magnetic perturbation fields have been measured using a fast ion loss detector. Comparisons with simulations are shown. In addition, nonlinear interactions between fast ions and independent AE waves are revealed by this technique.

  19. Ranges of 10-350 keV H and H2 ions in (1 1 1) diamond

    NASA Astrophysics Data System (ADS)

    Popov, V. P.; Ilnitskii, M. A.; Pokhil, G. P.; Titov, A. I.; Karaseov, P. A.; Karabeshkin, K. V.; Pal'yanov, Yu. N.; Rubanov, S.

    2017-09-01

    Understanding of the implantation process of the hydrogen ions into diamond is of great technological interest for the fabrication of the color centers required for quantum computing and sensing applications. Here, the hydrogen range and defect-depth distribution in (1 1 1) HPHT diamond irradiated with 10-350 keV/proton H+ and H2+ ions in non channeling direction are experimentally measured by means of cross-section transmission electron microscopy (X-TEM) and secondary ion mass spectroscopy (SIMS). Surface morphology was studied by atomic force microscopy. It is found that the proton ranges at energies below 100 keV are significantly (more than 50%) underestimated in TRIM simulations whereas measured profiles coincide well with simulated ones at ion energies above 100 keV. The difference at low energies is due to approximations used in TRIM code. First is overestimation of electron energy losses. In addition, binary collision approximation and/or ZBL potential in this energy range are not suitable for proton stopping in diamond.

  20. Radioactive Ion Beam Production Capabilities at the Holifield Radioactive Ion Beam Facility

    SciTech Connect

    Beene, James R; Dowling, Darryl T; Gross, Carl J; Juras, Raymond C; Liu, Yuan; Meigs, Martha J; Mendez, II, Anthony J; Nazarewicz, Witold; Sinclair, John William; Stracener, Daniel W; Tatum, B Alan

    2011-01-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) is a national user facility for research with radioactive ion beams (RIBs) that has been in routine operation since 1996. It is located at Oak Ridge National Laboratory (ORNL) and operated by the ORNL Physics Division. The principal mission of HRIBF is the production of high-quality beams of short-lived radioactive isotopes to support research in nuclear structure physics and nuclear astrophysics. HRIBF is currently unique worldwide in its ability to provide neutron-rich fission fragment beams post-accelerated to energies above the Coulomb barrier for nuclear reactions.

  1. Reversal ion source - A new source of negative ion beams

    NASA Technical Reports Server (NTRS)

    Orient, O. J.; Chutjian, A.; Alajajian, S. H.

    1985-01-01

    A new type of ion source utilizing beams of electrons and target molecules, rather than a diffuse, volume plasma, is described. The source utilizes an electrostatic electron 'mirror' which reverses trajectories in an electron beam, producing electrons at their turning point having a distribution of velocities centered at zero velocity. A gas which attaches zero-velocity electrons is introduced at this turning point. Negative ions are produced by an attachment or dissociative attachment process. For many of the thermal electron-attaching molecules the cross sections can be quite large, varying as the inverse square root of the electron energy or just the s-wave threshold law. The efficiency and current density of the ion source for production of Cl(-) through the large, thermal energy attachment process is estimated. It is argued that the source can be used for the production of negative ions through attachment resonances located at higher energies as well.

  2. Diagnosis of high-intensity pulsed heavy ion beam generated by a novel magnetically insulated diode with gas puff plasma gun.

    PubMed

    Ito, H; Miyake, H; Masugata, K

    2008-10-01

    Intense pulsed heavy ion beam is expected to be applied to materials processing including surface modification and ion implantation. For those applications, it is very important to generate high-purity ion beams with various ion species. For this purpose, we have developed a new type of a magnetically insulated ion diode with an active ion source of a gas puff plasma gun. When the ion diode was operated at a diode voltage of about 190 kV, a diode current of about 15 kA, and a pulse duration of about 100 ns, the ion beam with an ion current density of 54 A/cm(2) was obtained at 50 mm downstream from the anode. By evaluating the ion species and the energy spectrum of the ion beam via a Thomson parabola spectrometer, it was confirmed that the ion beam consists of nitrogen ions (N(+) and N(2+)) of energy of 100-400 keV and the proton impurities of energy of 90-200 keV. The purity of the beam was evaluated to be 94%. The high-purity pulsed nitrogen ion beam was successfully obtained by the developed ion diode system.

  3. Optimization of the beam extraction systems for the Linac4 H{sup −} ion source

    SciTech Connect

    Fink, D. A.; Lettry, J.; Scrivens, R.; Steyaert, D.; Midttun, Ø.; Valerio-Lizarraga, C. A.

    2015-04-08

    The development of the Linac 4 and its integration into CERN’s acceleration complex is part of the foreseen luminosity upgrade of the Large Hadron Collider (LHC). The goal is to inject a 160 MeV H{sup −} beam into the CERN PS Booster (PSB) in order to increase the beam brightness by a factor of 2 compared to the 50 MeV proton linac, Linac 2, that is currently in operation. The requirements for the ion source are a 45 keV H{sup −} beam of 80 mA intensity, 2 Hz repetition rate and 0.5 ms pulse length within a normalized rms-emittance of 0.25 mm· mrad. The previously installed beam extraction system has been designed for an H{sup −} ion beam intensity of 20 mA produced by an RF-volume source with an electron to H{sup −} ratio of up to 50. For the required intensity upgrades of the Linac4 ion source, a new beam extraction system is being produced and tested; it is optimized for a cesiated surface RF-source with a nominal beam current of 40 mA and an electron to H{sup −} ratio of 4. The simulations, based on the IBSIMU code, are presented. At the Brookhaven National Laboratory (BNL), a peak beam current of more than 100 mA was demonstrated with a magnetron H{sup −} source at an energy of 35 keV and a repetition rate of 2 Hz. A new extraction system is required to operate at an energy of 45 keV; simulation of a two stage extraction system dedicated to the magnetron is presented.

  4. Induction of antioxidant enzyme activity and lipid peroxidation level in ion-beam-bombarded rice seeds

    NASA Astrophysics Data System (ADS)

    Semsang, Nuananong; Yu, LiangDeng

    2013-07-01

    Low-energy ion beam bombardment has been used to mutate a wide variety of plant species. To explore the indirect effects of low-energy ion beam on biological damage due to the free radical production in plant cells, the increase in antioxidant enzyme activities and lipid peroxidation level was investigated in ion-bombarded rice seeds. Local rice seeds were bombarded with nitrogen or argon ion beams at energies of 29-60 keV and ion fluences of 1 × 1016 ions cm-2. The activities of the antioxidant enzymes; superoxide dismutase (SOD), catalase (CAT), ascorbate peroxidase (APX), dehydroascorbate reductase (DHAR), glutathione reductase (GR), glutathione S-transferase (GST) and lipid peroxidation level were assayed in the germinated rice seeds after ion bombardment. The results showed most of the enzyme activities and lipid peroxidation levels in both the argon and nitrogen bombarded samples were higher than those in the natural control. N-ion bombardment could induce higher levels of antioxidant enzyme activities in the rice samples than the Ar-ion bombardment. Additional effects due to the vacuum condition were found to affect activities of some antioxidant enzymes and lipid peroxidation level. This study demonstrates that ion beam bombardment and vacuum condition could induce the antioxidant enzyme activity and lipid peroxidation level which might be due to free radical production in the bombarded rice seeds.

  5. Extraction Simulations and Emittance Measurements of a Holifield Radioactive Ion Beam Facility Electron Beam Plasma Source for Radioactive Ion Beams

    SciTech Connect

    Mendez, II, Anthony J; Liu, Yuan

    2010-01-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) at Oak Ridge National Laboratory has a variety of ion sources used to produce radioactive ion beams (RIBs). Of these, the workhorse is an electron beam plasma (EBP) ion source. The recent addition of a second RIB injector, the Injector for Radioactive Ion Species 2 (IRIS2), for the HRIBF tandem accelerator prompted new studies of the optics of the beam extraction from the EBP source. The source was modeled using SIMION V8.0, and results will be presented, including comparison of the emittances as predicted by simulation and as measured at the HRIBF offline ion source test facilities. Also presented will be the impact on phase space shape resulting from extraction optics modifications implemented at IRIS2.

  6. Physics with fast molecular-ion beams

    SciTech Connect

    Kanter, E.P.

    1980-01-01

    Fast (MeV) molecular-ion beams provide a unique source of energetic projectile nuclei which are correlated in space and time. The recognition of this property has prompted several recent investigations of various aspects of the interactions of these ions with matter. High-resolution measurements on the fragments resulting from these interactions have already yielded a wealth of new information on such diverse topics as plasma oscillations in solids and stereochemical structures of molecular ions as well as a variety of atomic collision phenomena. The general features of several such experiments will be discussed and recent results will be presented.

  7. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, B.C.; Stutz, R.A.

    1998-06-30

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  8. Focused ion beam micromilling and articles therefrom

    DOEpatents

    Lamartine, Bruce C.; Stutz, Roger A.

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  9. Ion beam analysis techniques in interdisciplinary applications

    SciTech Connect

    Respaldiza, Miguel A.; Ager, Francisco J.

    1999-11-16

    The ion beam analysis techniques emerge in the last years as one of the main applications of electrostatic accelerators. A short summary of the most used IBA techniques will be given as well as some examples of applications in interdisciplinary sciences.

  10. Ion Beam Analysis Techniques in Interdisciplinary Applications

    SciTech Connect

    Respaldiza, Miguel A.; Ager, Francisco J.

    1999-12-31

    The ion beam analysis techniques emerge in the last years as one of the main applications of electrostatic accelerators. A short summary of the most used IBA techniques will be given as well as some examples of applications in interdisciplinary sciences.

  11. Metal assisted focused-ion beam nanopatterning

    NASA Astrophysics Data System (ADS)

    Kannegulla, Akash; Cheng, Li-Jing

    2016-09-01

    Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates.

  12. Graphene engineering by neon ion beams

    NASA Astrophysics Data System (ADS)

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-03-01

    Achieving the ultimate limits of lithographic resolution and material performance necessitates engineering of matter with atomic, molecular, and mesoscale fidelity. With the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of 2D materials, such as graphene-based nanoelectronics, is coming to the forefront as a tool for fabrication and surface manipulation. However, the effects of using a Ne focused-ion-beam on the fidelity of structures created out of 2D materials have yet to be explored. Here, we will discuss the use of energetic Ne ions in engineering graphene nanostructures and explore their mechanical, electromechanical and chemical properties using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we are able to ascertain changes in the mechanical, electrical and optical properties of Ne+ beam milled graphene nanostructures and surrounding regions. Additionally, we are able to link localized defects around the milled graphene to ion milling parameters such as dwell time and number of beam passes in order to characterize the induced changes in mechanical and electromechanical properties of the graphene surface.

  13. Beam monitor calibration in scanned light-ion beams.

    PubMed

    Palmans, Hugo; Vatnitsky, Stanislav M

    2016-11-01

    To propose a formalism for the reference dosimetry of scanned light-ion beams consistent with IAEA TRS-398 and Alfonso et al. [Med. Phys. 35, 5179-5186 (2008)]. To identify machine-specific reference (msr) fields and plan-class specific reference (pcsr) fields consistent with the definitions given by Alfonso et al. To review the literature of beam monitor calibration in scanned beams using three different methods in terms of this common formalism. Four types of msr fields are identified as those that are meant to calibrate the beam monitor for scanned beams with particular energies. Two types of pcsr fields are identified as those that are meant to apply one or more tuning factors to the entire delivery chain. The formalism establishes the energy-dependent relation between the number of particles incident on the phantom surface and the beam monitor reading and distinguishes three routes to determine the beam monitor calibration function: (i) the use of a calibrated reference ionization chamber in a single-layer scanned beam, (ii) the use of a cross-calibrated large-area parallel plate ionization chamber in a single-energy beamlet, and (iii) the use of a calibrated reference ionization chamber in a box field to adjust a calibration curve obtained by a Faraday cup or an ionization chamber. Examples of all three methods and comparisons between them from the literature are analysed. The formalism can form the basis of future dosimetry recommendations for scanned particle beams and the analysis of the literature data in terms of this formalism can form the basis of data compilations for the application of the dosimetry procedures.

  14. Laser-cooled bunched ion beam

    SciTech Connect

    Schiffer, J.P.; Hangst, J.S.; Nielsen, J.S.

    1995-08-01

    In collaboration with the Arhus group, the laser cooling of a beam bunched by an rf electrode was investigated at the ASTRID storage ring. A single laser is used for unidirectional cooling, since the longitudinal velocity of the beam will undergo {open_quotes}synchrotron oscillations{close_quotes} and the ions are trapped in velocity space. As the cooling proceeds the velocity spread of the beam, as well as the bunch length is measured. The bunch length decreases to the point where it is limited only by the Coulomb repulsion between ions. The measured length is slightly (20-30%) smaller than the calculated limit for a cold beam. This may be the accuracy of the measurement, or may indicate that the beam still has a large transverse temperature so that the longitudinal repulsion is less than would be expected from an absolutely cold beam. Simulations suggest that the coupling between transverse and longitudinal degrees of freedom is strong -- but this issue will have to be resolved by further measurements.

  15. Ion Beam Driven Warm Dense Matter Experiments

    NASA Astrophysics Data System (ADS)

    Bieniosek, F. M.; Henestroza, E.; Leitner, M. A.; Lidia, S. M.; Logan, B. G.; More, R. M.; Ni, P. A.; Seidl, P. A.; Waldron, W. L.; Barnard, J. J.

    2008-11-01

    We report plans and experimental results in ion beam-driven warm dense matter (WDM) experiments. Initial experiments use a 0.3 MeV K+ beam from the NDCX-I accelerator. The WDM conditions are to be achieved by longitudinal and transverse neutralized drift compression to provide a hot spot on the target with a 1-mm beam spot size, and 2-ns pulse length. As a technique for heating matter to high energy density, intense ion beams can deliver precise and uniform beam energy deposition, in a relatively large sample size, and can heat any solid-phase target material. The range of the beams in solid targets is less than 1 micron, which can be lengthened by using reduced density porous targets. We have developed a WDM target chamber and target diagnostics including a fast multi-channel optical pyrometer, optical streak camera, VISAR, and high-speed gated cameras. Initial experiments will explore measurement of temperature and other target parameters. Experiments are planned in areas such as dense electronegative targets, porous target homogenization and two-phase equation of state.

  16. Surface alloying by ion, electron and laser beams

    SciTech Connect

    Rehn, L.E.; Picraux, S.T.; Wiedersich, H.

    1986-01-01

    This book presents the papers given at a conference on the surface treatments of alloys using ion, electron, and laser beams. Topics considered at the conference included energy deposition, heat flow, rapid solidification, physical radiation effects, ion implantation, ion-irradiated materials, microstructure, solute redistribution, surface-melted alloys, solute trapping in ion-implanted metals, and the industrial applications of ion beam processes.

  17. Ion beam deposition in materials research

    NASA Astrophysics Data System (ADS)

    Zuhr, R. A.; Pennycook, S. J.; Noggle, T. S.; Herbots, N.; Haynes, T. E.; Appleton, B. R.

    1989-02-01

    Ion beam deposition (IBD) is the direct formation of thin films using a low-energy (tens of eV) mass-analyzed ion beam. The process allows depositions in which the energy, isotopic species, deposition rate, defect production, and many other beam and sample parameters can be accurately controlled. This paper will review recent research at ORNL on the IBD process and the effects of deposition parameters on the materials properties of deposited thin films, epitaxial layers, and isotopic heterostructures. A variety of techniques including ion scattering/channeling, cross-sectional transmission electron microscopy, scanning electron microscopy, and Auger spectroscopy has been used for analysis. The fabrication of isotopic heterostructures of 74Ge and 30Si will be discussed, as well as the fabrication of metal and semiconductor overlayers on Si and Ge. The use of IBD for low-temperature epitaxy of 30Si on Si and 76Ge on Ge will be presented. The use of self-ion sputter cleaning and in situ reactive ion cleaning as methods for preparing single-crystal substrates for epitaxial deposition will be discussed. Examples of IBD formation of oxides and suicides on Si at low temperatures will also be presented.

  18. Optimization of a charge-state analyzer for electron cyclotron resonance ion source beams.

    PubMed

    Saminathan, S; Beijers, J P M; Kremers, H R; Mironov, V; Mulder, J; Brandenburg, S

    2012-07-01

    A detailed experimental and simulation study of the extraction of a 24 keV He(+) beam from an ECR ion source and the subsequent beam transport through an analyzing magnet is presented. We find that such a slow ion beam is very sensitive to space-charge forces, but also that the neutralization of the beam's space charge by secondary electrons is virtually complete for beam currents up to at least 0.5 mA. The beam emittance directly behind the extraction system is 65 π mm mrad and is determined by the fact that the ion beam is extracted in the strong magnetic fringe field of the ion source. The relatively large emittance of the beam and its non-paraxiality lead, in combination with a relatively small magnet gap, to significant beam losses and a five-fold increase of the effective beam emittance during its transport through the analyzing magnet. The calculated beam profile and phase-space distributions in the image plane of the analyzing magnet agree well with measurements. The kinematic and magnet aberrations have been studied using the calculated second-order transfer map of the analyzing magnet, with which we can reproduce the phase-space distributions of the ion beam behind the analyzing magnet. Using the transfer map and trajectory calculations we have worked out an aberration compensation scheme based on the addition of compensating hexapole components to the main dipole field by modifying the shape of the poles. The simulations predict that by compensating the kinematic and geometric aberrations in this way and enlarging the pole gap the overall beam transport efficiency can be increased from 16% to 45%.

  19. Direct evidence of strongly inhomogeneous energy deposition in target heating with laser-produced ion beams

    SciTech Connect

    Brambrink, E.; Audebert, P.; Schlegel, T.; Malka, G.; Aleonard, M. M.; Claverie, G.; Gerbaux, M.; Gobet, F.; Hannachi, F.; Scheurer, J. N.; Tarisien, M.; Amthor, K. U.; Meot, V.; Morel, P.

    2007-06-15

    We report on strong nonuniformities in target heating with intense, laser-produced proton beams. The observed inhomogeneity in energy deposition can strongly perturb equation of state (EOS) measurements with laser-accelerated ions which are planned in several laboratories. Interferometric measurements of the target expansion show different expansion velocities on the front and rear surfaces, indicating a strong difference in local temperature. The nonuniformity indicates at an additional heating mechanism, which seems to originate from electrons in the keV range.

  20. Direct evidence of strongly inhomogeneous energy deposition in target heating with laser-produced ion beams.

    PubMed

    Brambrink, E; Schlegel, T; Malka, G; Amthor, K U; Aléonard, M M; Claverie, G; Gerbaux, M; Gobet, F; Hannachi, F; Méot, V; Morel, P; Nicolai, P; Scheurer, J N; Tarisien, M; Tikhonchuk, V; Audebert, P

    2007-06-01

    We report on strong nonuniformities in target heating with intense, laser-produced proton beams. The observed inhomogeneity in energy deposition can strongly perturb equation of state (EOS) measurements with laser-accelerated ions which are planned in several laboratories. Interferometric measurements of the target expansion show different expansion velocities on the front and rear surfaces, indicating a strong difference in local temperature. The nonuniformity indicates at an additional heating mechanism, which seems to originate from electrons in the keV range.

  1. MULTIPLE ELECTRON BEAM ION PUMP AND SOURCE

    DOEpatents

    Ellis, R.E.

    1962-02-27

    A vacuum pump is designed which operates by ionizing incoming air and by withdrawing the ions from the system by means of electrical fields. The apparatus comprises a cylindrical housing communicable with the vessel to be evacuated and having a thin wall section in one end. Suitable coils provide a longitudinal magnetic field within the cylinder. A broad cathode and an anode structure is provided to establish a plurality of adjacent electron beams which are parallel to the cylinder axis. Electron reflector means are provided so that each of the beams constitutes a PIG or reflex discharge. Such structure provides a large region in which incoming gas molecules may be ionized by electron bombardment. A charged electrode assembly accelerates the ions through the thin window, thereby removing the gas from the system. The invention may also be utilized as a highly efficient ion source. (AEC)

  2. Radioactive Ion Beam Purification by Selective Adsorption

    NASA Astrophysics Data System (ADS)

    Jost, C.; Carter, H. K.; Griffith, B. O.; Reed, C. A.; Kratz, K.-L.; Stora, T.; Stracener, D. W.

    2008-10-01

    Isobaric contaminations in ISOL beams are a recurrent problem in nuclear physics experiments. Surface effects in the transfer line between target and ion source can be employed to achieve additional selectivity. Since interactions of the atoms' outer electrons with the surface determine adsorption behavior it can change drastically within an isobaric chain, introducing a chemical selectivity. Quartz transfer lines are currently applied at ISOLDE to reduce alkali contaminations [1]. We will conduct an on-line study of the adsorption behavior of fission products on a range of materials stable at high temperatures. Therefore a special target--ion source unit with a variable-temperature transfer line and interchangeable liner has been constructed in collaboration with the ISOLDE technical group. Results of first tests using new adsorption materials at the on-line separator test facility at Holifield Radioactive Ion Beam Facility, ORNL, will be presented. [1] Bouquerel et al., Europ. Phys. J. -- Spec. Top. 150, 277 (2006)

  3. Neutral beam dose and sputtering characteristics in an ion implantation system

    NASA Technical Reports Server (NTRS)

    Roberts, A. S., Jr.; Ash, R. L.; Berger, M. H.

    1973-01-01

    A technique and instrument design for calorimetric detection of the neutral atom content of a 60 keV argon ion beam. A beam sampling method is used to measure local heat flux to a small platinum wire at steady state; integration of power density profiles leads to a determination of equivalent neutral beam current. The fast neutral production occurs as a result of charge transfer processes in the region of the beam system between analyzing magnet and beam stop where the pressure remains less than .00001 torr. A description of the neutral beam detector is given in section along with a presentation of results. An elementary analysis of sputter material transport from target to substrate was performed; the analysis relates to semiconductor sputtering.

  4. Spectroscopy of ions using fast beams and ion traps

    SciTech Connect

    Pinnington, E H; Trabert, E

    2004-10-01

    A knowledge of the spectra of ionized atoms is of importance in many fields. They can be studied in a wide variety of light sources. In recent years techniques coming under the broad heatings of fast beams and ion traps have been used extensively for such investigations. This article considers the advantages that various techniques have for particular applications.

  5. Ion Beam Etching: Replication of Micro Nano-structured 3D Stencil Masks

    SciTech Connect

    Weber, Patrick; Guibert, Edouard; Mikhailov, Serguei; Bruegger, Juergen; Villanueva, Guillermo

    2009-03-10

    Ion beam LIGA allows the etching of 3D nano-structures by direct writing with a nano-sized beam. However, this is a relatively time consuming process. We propose here another approach for etching structures on large surfaces and faster, compared to the direct writing process. This approach consists of replicating 3D structured masks, by scanning an unfocused ion beam. A polymer substrate is placed behind the mask, as in UV photolithography. But the main advantage is that the 3D structure of the mask can be replicated into the polymer. For that purpose, the masks (developped at LMIS1, EPFL) are made of a silicon nitride membrane 100 nm thick, on which 3D gold structures up to 200 nm thick, are deposited. The 3D Au structures are made with the nanostencil method, based on successive gold deposition. The IMA institute, from HE-Arc, owns a High Voltage Engineering 1.7 MV Tandetron with both solid and gaseous negative ion sources, able to generate ions from almost every chemical element in a broad range of energies comprised between 400 keV and 6.8 MeV. The beam composition and energy are chosen in such a way, that ions lose a significant fraction of their energy when passing through the thickest regions of the mask. Ions passing through thinner regions of the mask loose a smaller fraction of their energy and etch the polymer with larger thicknesses, allowing a replication of the mask into the polymer. For our trials, we have used a carbon beam with an energy of 500 keV. The beam was focussed to a diameter of 5 mm with solid slits, in order to avoid border effects and thus ensure a homogeneous dose distribution on the beam diameter. The feasibility of this technique has been demonstrated, allowing industrial applications for micro-mould fabrication, micro-fluidics and micro-optics.

  6. Ion beam generated modes in the lower hybrid frequency range in a laboratory magnetoplasma

    NASA Astrophysics Data System (ADS)

    Van Compernolle, B.; Tripathi, S.; Gekelman, W. N.; Colestock, P. L.; Pribyl, P.

    2012-12-01

    The generation of waves by ion ring distributions is of great importance in many instances in space plasmas. They occur naturally in the magnetosphere through the interaction with substorms, or they can be man-made in ionospheric experiments by photo-ionization of neutral atoms injected perpendicular to the earth's magnetic field. The interaction of a fast ion beam with a low β plasma has been studied in the laboratory. Experiments were performed at the LArge Plasma Device (LAPD) at UCLA. The experiments were done in a Helium plasma (n ≃ 1012 \\ cm-3, B0 = 1000 G - 1800 G, fpe}/f{ce ≃ 1 - 5, Te = 0.25\\ eV, vte ≤ vA). The ion beam \\cite{Tripathi_ionbeam} is a Helium beam with energies ranging from 5 keV to 18 keV. The fast ion velocity is on the order of the Alfvén velocity. The beam is injected from the end of the machine, and spirals down the linear device. Waves were observed below fci in the shear Alfvén wave regime, and in a broad spectrum above fci in the lower hybrid frequency range, the focus of this paper. The wave spectra have distinct peaks close to ion cyclotron harmonics, extending out to the 100th harmonic in some cases. The wave generation was studied for various magnetic fields and background plasma densities, as well as for different beam energies and pitch angles. The waves were measured with 3-axis electric and magnetic probes. Detailed measurements of the perpendicular mode structure will be shown. Langmuir probes were used to measure density and temperature evolution due to the beam-plasma interaction. Retarding field energy analyzers captured the ion beam profiles. The work was performed at the LArge Plasma Device at the Basic Plasma Science Facility (BaPSF) at UCLA, funded by DOE/NSF.

  7. Patterned ion beam implantation of Co ions into a SiO2 thin film via ordered nanoporous alumina masks.

    PubMed

    Guan, Wei; Ghatak, Jay; Peng, Yong; Peng, Nianhua; Jeynes, Chris; Inkson, Beverley; Möbus, Günter

    2012-02-03

    Spatially patterned ion beam implantation of 190 keV Co(+) ions into a SiO(2) thin film on a Si substrate has been achieved by using nanoporous anodic aluminum oxide with a pore diameter of 125 nm as a mask. The successful synthesis of periodic embedded Co regions using pattern transfer is demonstrated for the first time using cross-sectional (scanning) transmission electron microscopy (TEM) in combination with analytical TEM. Implanted Co regions are found at the correct relative lateral periodicity given by the mask and at a depth of about 120 nm.

  8. Is low-energy-ion bombardment generated X-ray emission a secondary mutational source to ion-beam-induced genetic mutation?

    NASA Astrophysics Data System (ADS)

    Thongkumkoon, P.; Prakrajang, K.; Thopan, P.; Yaopromsiri, C.; Suwannakachorn, D.; Yu, L. D.

    2013-07-01

    Low-energy ion beam biotechnology has achieved tremendous successes in inducing crop mutation and gene transfer. However, mechanisms involved in the related processes are not yet well understood. In ion-beam-induced mutation, ion-bombardment-produced X-ray has been proposed to be one of the secondary mutation sources, but the speculation has not yet been experimentally tested. We carried out this investigation to test whether the low-energy ion-beam-produced X-ray was a source of ion-beam-induced mutation. In the investigation, X-ray emission from 29-keV nitrogen- or argon- ion beam bombarded bacterial Escherichia coli (E. coli) cells held in a metal or plastic sample holder was in situ detected using a highly sensitive X-ray detector. The ion beam bombarded bacterial cells held in different material holders were observed for mutation induction. The results led to a conclusion that secondary X-ray emitted from ion-beam-bombarded biological living materials themselves was not a, or at least a negligible, mutational source, but the ion-beam-induced X-ray emission from the metal that made the sample holder could be a source of mutation.

  9. Numerical Simulation of Ion Rings and Ion Beam Propagation.

    NASA Astrophysics Data System (ADS)

    Mankofsky, Alan

    This thesis presents the development of numerical simulation techniques for studying the physics of ion beams and rings in a background plasma as applicable to certain problems in magnetic and inertial confinement fusion. Two codes have been developed for these purposes: RINGA and CIDER. The 2 and 1/2-dimensional (r,z,v(,r),v(,(theta)),v(,z); (PAR-DIFF)/(PAR-DIFF)(theta) = 0) particle code RINGA follows the trajectories of ions in their self-consistent magnetic field. The code assumes strict charge neutrality and admits currents only in the azimuthal direction, i.e., (PHI) = J(,r) = J(,z) = 0. The injection and resistive trapping of ion rings has been studied with RINGA. The number of particles trapped as a fraction of the total number injected N is found to be strongly dependent upon (1) N (in the range 2.85 x 10('16) - 3.99 x 10('17)) and (2) mirror ratios in the system (1.05 -1.14), and more weakly dependent upon (3) wall resistance per unit length (0.72 (OMEGA)/cm - 1.80 (OMEGA)/cm) and (4) beam divergence (0(DEGREES)-6(DEGREES)). Fractions of trapped particles in excess of 0.9 have been observed. Modifications to RINGA to include finite pressure of confined plasma and beam ion-electron slowing down collisions are discussed. Finite plasma pressure leads to a diamagnetic current which increases the field reversal factor in ion ring equilibria, while causing the closed flux surfaces to expand outward. The ideal magnetohydrodynamic stability of the plasma is analyzed in the high toroidal mode number limit, where the beam ions are noninteracting. The existence of stable high-(beta) equilibria is demonstrated. One such equilibrium, stable to both ideal interchange and ballooning modes, has <(beta)> (TBOND) 8(pi) / (DBLTURN) 55%. In the CIDER hybrid code, ions are represented by particles and electrons by an inertialess thermal fluid which obeys a generalized Ohm's law. Fields are solved in the quasineutral Darwin approximation. Several collisional and atomic

  10. Electron-capture collisions at keV energies of multiply charged ions of carbon and argon with molecular deuterium

    SciTech Connect

    Bliman, S.; Aubert, J.; Geller, R.; Jacquot, B.; Van Houtte, D.

    1981-04-01

    Single- and double-electron-capture cross sections have been measured for C/sup q/+ with initial charges 2 < or = q < or = 6 and for Ar/sup q/+ with initial charges 2 < or = q < or = 12 incident on molecular deuterium gas targets. The cross sections show little dependence on the incident-ion energy for the range studied 2q to 10q keV. The single-electron-capture cross sections do not vary monotonically with the initial charge, but show an oscillation about a mean curve, reflecting the projectile electronic structure.

  11. High sensitivity charge amplifier for ion beam uniformity monitor

    DOEpatents

    Johnson, Gary W.

    2001-01-01

    An ion beam uniformity monitor for very low beam currents using a high-sensitivity charge amplifier with bias compensation. The ion beam monitor is used to assess the uniformity of a raster-scanned ion beam, such as used in an ion implanter, and utilizes four Faraday cups placed in the geometric corners of the target area. Current from each cup is integrated with respect to time, thus measuring accumulated dose, or charge, in Coulombs. By comparing the dose at each corner, a qualitative assessment of ion beam uniformity is made possible. With knowledge of the relative area of the Faraday cups, the ion flux and areal dose can also be obtained.

  12. Enhancing ion yields in time-of-flight-secondary ion mass spectrometry: a comparative study of argon and water cluster primary beams.

    PubMed

    Sheraz née Rabbani, Sadia; Razo, Irma Berrueta; Kohn, Taylor; Lockyer, Nicholas P; Vickerman, John C

    2015-02-17

    Following from our previous Letter on this topic, this Article reports a detailed study of time-of-flight-secondary ion mass spectrometry (TOF-SIMS) positive ion spectra generated from a set of model biocompounds (arginine, trehalose, DPPC, and angiotensin II) by water cluster primary ion beams in comparison to argon cluster beams over a range of cluster sizes and energies. Sputter yield studies using argon and water beams on arginine and Irganox 1010 have confirmed that the sputter yields using water cluster beams lie on the same universal sputtering curve derived by Seah for argon cluster beams. Thus, increased ion yield using water cluster beams must arise from increased ionization. The spectra and positive ion signals observed using cluster beams in the size range from 1,000 to 10,000 and the energy range 5-20 keV are reported. It is confirmed that water cluster beams enhance proton related ionization over against argon beams to a significant degree such that enhanced detection sensitivities from 1 μm(2) in the region of 100 to 1,000 times relative to static SIMS analysis with Ar2000 cluster beams appear to be accessible. These new studies show that there is an unexpected complexity in the ionization enhancement phenomenon. Whereas optimum ion yields under argon cluster bombardment occur in the region of E/n ≥ 10 eV (where E is the beam energy and n the number of argon atoms in the cluster) and fall rapidly when E/n < 10 eV; for water cluster beams, ion yields increase significantly in this E/n regime (where n is the number of water molecules in the cluster) and peak for 20 keV beams at a cluster size of 7,000 or E/n ∼3 eV. This important result is explored further using D2O cluster beams that confirm that in this low E/n regime protonation does originate to a large extent from the water molecules. The results, encouraging in themselves, suggest that for both argon and water cluster beams, higher energy beams, e.g., 40 and 80 keV, would enable larger

  13. Silicon ion irradiation effects on the magnetic properties of ion beam synthesized CoPt phase

    SciTech Connect

    Balaji, S.; Amirthapandian, S.; Panigrahi, B. K.; Mangamma, G.; Kalavathi, S.; Gupta, Ajay; Nair, K. G. M.

    2012-06-05

    Ion beam mixing of Pt/Co bilayers using self ion (Pt{sup +}) beam results in formation of CoPt phase. Upon ion beam annealing the ion mixed samples using 4 MeV Si{sup +} ions at 300 deg. C, diffusion of Co towards the Pt/Co interface is observed. The Si{sup +} ion beam rotates the magnetization of the CoPt phase from in plane to out of plane of the film.

  14. The improvement of mechanical properties of aluminum nitride and alumina by 1 keV Ar{sup +} ion irradiation in reactive gas environment

    SciTech Connect

    Koh, S.K.; Son, Y.B.; Gam, J.S.; Kim, C.J.; Choi, W.K.; Jung, H.J.

    1996-12-31

    Ar ions with 1 keV energy was irradiated on aluminum nitride in an O{sub 2} environment to increase the bonding strength with Cu and also on alumina in an N{sub 2} environment to increase the bending strength. Cu(1,000 {angstrom}) films were deposited by ion-beam sputter on Ar{sup +} irradiated/unirradiated AlN surfaces and the change of the bond strength was investigated by a scratch test. For the study of chemical structural change don the Ar{sup +} irradiated AlN surface. Cu(50{angstrom}) were deposited on an AlN substrate and XPS depth profile analysis was performed. Cu films deposited on Ar{sup +} irradiated AlN under an O{sub 2} environment showed the bond strength of 30 Newton by a scratch test. On the basis of Cu3p, Al2p near core levels and O1s, N1s core level spectra, it was found that the improvement of bond strength of Cu films on the AlN surface resulted from the formation of intermediate layers such as copper oxide and aluminum oxynitride. The bending strength of polycrystalline alumina irradiated by Ar ions in an N{sub 2} environment was also increased.

  15. Ion energy distribution near a plasma meniscus with beam extraction for multi element focused ion beams

    SciTech Connect

    Mathew, Jose V.; Paul, Samit; Bhattacharjee, Sudeep

    2010-05-15

    An earlier study of the axial ion energy distribution in the extraction region (plasma meniscus) of a compact microwave plasma ion source showed that the axial ion energy spread near the meniscus is small ({approx}5 eV) and comparable to that of a liquid metal ion source, making it a promising candidate for focused ion beam (FIB) applications [J. V. Mathew and S. Bhattacharjee, J. Appl. Phys. 105, 96101 (2009)]. In the present work we have investigated the radial ion energy distribution (IED) under the influence of beam extraction. Initially a single Einzel lens system has been used for beam extraction with potentials up to -6 kV for obtaining parallel beams. In situ measurements of IED with extraction voltages upto -5 kV indicates that beam extraction has a weak influence on the energy spread ({+-}0.5 eV) which is of significance from the point of view of FIB applications. It is found that by reducing the geometrical acceptance angle at the ion energy analyzer probe, close to unidirectional distribution can be obtained with a spread that is smaller by at least 1 eV.

  16. Development of a beam ion velocity detector for the heavy ion beam probe

    NASA Astrophysics Data System (ADS)

    Fimognari, P. J.; Crowley, T. P.; Demers, D. R.

    2016-11-01

    In an axisymmetric plasma, the conservation of canonical angular momentum constrains heavy ion beam probe (HIBP) trajectories such that measurement of the toroidal velocity component of secondary ions provides a localized determination of the poloidal flux at the volume where they originated. We have developed a prototype detector which is designed to determine the beam angle in one dimension through the detection of ion current landing on two parallel planes of detecting elements. A set of apertures creates a pattern of ion current on wires in the first plane and solid metal plates behind them; the relative amounts detected by the wires and plates determine the angle which beam ions enter the detector, which is used to infer the toroidal velocity component. The design evolved from a series of simulations within which we modeled ion beam velocity changes due to equilibrium and fluctuating magnetic fields, along with the ion beam profile and velocity dispersion, and studied how these and characteristics such as the size, cross section, and spacing of the detector elements affect performance.

  17. Development of a beam ion velocity detector for the heavy ion beam probe

    SciTech Connect

    Fimognari, P. J. Crowley, T. P.; Demers, D. R.

    2016-11-15

    In an axisymmetric plasma, the conservation of canonical angular momentum constrains heavy ion beam probe (HIBP) trajectories such that measurement of the toroidal velocity component of secondary ions provides a localized determination of the poloidal flux at the volume where they originated. We have developed a prototype detector which is designed to determine the beam angle in one dimension through the detection of ion current landing on two parallel planes of detecting elements. A set of apertures creates a pattern of ion current on wires in the first plane and solid metal plates behind them; the relative amounts detected by the wires and plates determine the angle which beam ions enter the detector, which is used to infer the toroidal velocity component. The design evolved from a series of simulations within which we modeled ion beam velocity changes due to equilibrium and fluctuating magnetic fields, along with the ion beam profile and velocity dispersion, and studied how these and characteristics such as the size, cross section, and spacing of the detector elements affect performance.

  18. Operating characteristics of a new ion source for KSTAR neutral beam injection system.

    PubMed

    Kim, Tae-Seong; Jeong, Seung Ho; Chang, Doo-Hee; Lee, Kwang Won; In, Sang-Ryul

    2014-02-01

    A new positive ion source for the Korea Superconducting Tokamak Advanced Research neutral beam injection (KSTAR NBI-1) system was designed, fabricated, and assembled in 2011. The characteristics of the arc discharge and beam extraction were investigated using hydrogen and helium gas to find the optimum operating parameters of the arc power, filament voltage, gas pressure, extracting voltage, accelerating voltage, and decelerating voltage at the neutral beam test stand at the Korea Atomic Energy Research Institute in 2012. Based on the optimum operating condition, the new ion source was then conditioned, and performance tests were primarily finished. The accelerator system with enlarged apertures can extract a maximum 65 A ion beam with a beam energy of 100 keV. The arc efficiency and optimum beam perveance, at which the beam divergence is at a minimum, are estimated to be 1.0 A/kW and 2.5 uP, respectively. The beam extraction tests show that the design goal of delivering a 2 MW deuterium neutral beam into the KSTAR Tokamak plasma is achievable.

  19. Channeling technique to make nanoscale ion beams

    NASA Astrophysics Data System (ADS)

    Biryukov, V. M.; Bellucci, S.; Guidi, V.

    2005-04-01

    Particle channeling in a bent crystal lattice has led to an efficient instrument for beam steering at accelerators [Biryukov et al., Crystal Channeling and its Application at High Energy Accelerators, Springer, Berlin, 1997], demonstrated from MeV to TeV energies. In particular, crystal focusing of high-energy protons to micron size has been demonstrated at IHEP with the results well in match with Lindhard (critical angle) prediction. Channeling in crystal microstructures has been proposed as a unique source of a microbeam of high-energy particles [Bellucci et al., Phys. Rev. ST Accel. Beams 6 (2003) 033502]. Channeling in nanostructures (single-wall and multi-wall nanotubes) offers the opportunities to produce ion beams on nanoscale. Particles channeled in a nanotube (with typical diameter of about 1 nm) are trapped in two dimensions and can be steered (deflected, focused) with the efficiency similar to that of crystal channeling or better. This technique has been a subject of computer simulations, with experimental efforts under way in several high-energy labs, including IHEP. We present the theoretical outlook for making channeling-based nanoscale ion beams and report the experience with crystal-focused microscale proton beams.

  20. Ion beam sputter etching of orthopedic implanted alloy MP35N and resulting effects on fatigue

    NASA Technical Reports Server (NTRS)

    Wintucky, E. G.; Christopher, M.; Bahnuik, E.; Wang, S.

    1981-01-01

    The effects of two types of argon ion sputter etched surface structures on the tensile stress fatigue properties of orthopedic implant alloy MP35N were investigated. One surface structure was a natural texture resulting from direct bombardment by 1 keV argon ions. The other structure was a pattern of square holes milled into the surface by a 1 keV argon ion beam through a Ni screen mask. The etched surfaces were subjected to tensile stress only in fatigue tests designed to simulate the cyclic load conditions experienced by the stems of artificial hip joint implants. Both types of sputter etched surface structures were found to reduce the fatigue strength below that of smooth surface MP35N.

  1. Stencil mask technology for ion beam lithography

    NASA Astrophysics Data System (ADS)

    Ehrmann, Albrecht; Huber, Sabine; Kaesmaier, Rainer; Oelmann, Andreas B.; Struck, Thomas; Springer, Reinhard; Butschke, Joerg; Letzkus, Florian; Kragler, Karl; Loeschner, Hans; Rangelow, Ivo W.

    1998-12-01

    Ion beam lithography is one of the most promising future lithography technologies. A helium or hydrogen ion beam illuminates a stencil membrane mask and projects the image with 4X reduction to the wafer. The development of stencil masks is considered to be critical for the success of the new technology. Since 1997, within the European Ion Projection Lithography MEDEA (Microelectronic Devices for European Applications) project silicon stencil masks based on a wafer- flow process are developed. They are produced in a conventional wafer line. Six inch SOI (silicon-on-insulator) wafers are patterned with an e-beam wafer writing tool, then trenches are etched by plasma etching. Afterwards, the membrane is etched by wet etch using the SOI-oxide layer as an etch stop. The last step is to add a coating layer, which is sputtered onto the membrane. It protects the mask against ion irradiation damage. For metrology and inspection, methods used for conventional chromium masks as well as new techniques are investigated. Results from placement measurements on the Leica LMS IPRO tool will be presented. Finally, methods for CD measurement, defect inspection, repair and in-situ-cleaning in the stepper will be discussed, including experimental information of first tests.

  2. Ion beam emittance from an ECRIS

    SciTech Connect

    Spädtke, P. Lang, R.; Mäder, J.; Maimone, F.; Schlei, B. R.; Tinschert, K.; Biri, S.; Rácz, R.

    2016-02-15

    Simulation of ion beam extraction from an Electron Cyclotron Resonance Ion Source (ECRIS) is a fully 3 dimensional problem, even if the extraction geometry has cylindrical symmetry. Because of the strong magnetic flux density, not only the electrons are magnetized but also the Larmor radius of ions is much smaller than the geometrical dimension of the plasma chamber (Ø 64 × 179 mm). If we assume that the influence of collisions is small on the path of particles, we can do particle tracking through the plasma if the initial coordinates of particles are known. We generated starting coordinates of plasma ions by simulation of the plasma electrons, accelerated stochastically by the 14.5 GHz radio frequency power fed to the plasma. With that we were able to investigate the influence of different electron energies on the extracted beam. Using these assumptions, we can reproduce the experimental results obtained 10 years ago, where we monitored the beam profile with the help of viewing targets. Additionally, methods have been developed to investigate arbitrary 2D cuts of the 6D phase space. To this date, we are able to discuss full 4D information. Currently, we extend our analysis tool towards 5D and 6D, respectively.

  3. 60 keV Ar⁺-ion induced modification of microstructural, compositional, and vibrational properties of InSb

    SciTech Connect

    Datta, D. P.; Garg, S. K.; Som, T.; Satpati, B.; Kanjilal, A.; Dhara, S.; Kanjilal, D.

    2014-10-14

    Room temperature irradiation of InSb(111) by 60 keV Ar⁺-ions at normal (0°) and oblique (60°) angles of incidence led to the formation of nanoporous structure in the high fluence regime of 1×10¹⁷ to 3×10¹⁸ ions cm⁻². While a porous layer comprising of a network of interconnected nanofibers was generated by normal ion incidence, evolution of plate-like structures was observed for obliquely incident ions. Systematic studies of composition and structure using energy dispersive x-ray spectroscopy, Raman spectroscopy, x-ray photoelectron spectroscopy, Raman mapping, grazing incidence x-ray diffraction, and cross-sectional transmission electron microscopy revealed a high degree of oxidation of the ion-induced microstructures with the presence of In₂O₃ and Sb₂O₃ phases and presence of nanocrystallites within the nanoporous structures. The observed structural evolution was understood in terms of processes driven by ion-induced defect accumulation within InSb.

  4. Ion beam mixing of U-based bilayers

    SciTech Connect

    Rossi, F. ); Nastasi, M.; Cohen, M.; Olsen, C. ); Tesmer, J.R. ); Egert, C. )

    1991-06-01

    Bilayer samples of U/Al, U/Ti, U/Si, and U/C have been ion beam mixed with 400 keV Ar and U/Al with Xe ions at doses from 2{times}10{sup 15} to 1{times}10{sup 17} ions/cm{sup 2}. Mixing experiments were performed at various temperatures between 77 and 420 K. The amount of interfacial mixing, 4{ital Dt}, follows a linear dose dependence below a critical temperature depending on the system studied. Below this temperature, the mixing efficiency, defined as {partial derivative}(4{ital Dt})/{partial derivative}{Phi} where 4{ital Dt} is the mixing and {Phi} is the dose, is temperature independent. Its value, as well as the value of the transition temperature, agrees well with the thermodynamical model of chemically biased diffusion in a thermal spike for the four systems tested. The transition between the thermal spike regime and the temperature enhanced mixing regime was interpreted on the basis of an intracascade mechanism. The formation of an intermetallic compound in the U/Al system was detected and interpreted on a qualitative basis by crystallographic considerations.

  5. Ion beam system for implanting industrial products of various shapes

    NASA Astrophysics Data System (ADS)

    Denholm, A. S.; Wittkower, A. B.

    1985-01-01

    Implantation of metals and ceramics with ions of nitrogen and other species has improved surface properties such as friction, wear and corrosion in numerous industrial applications. Zymet has built a production machine to take advantage of this process which can implant a 2 × 10 17 ions/cm 2 dose of nitrogen ions into a 20 cm × 20 cm area in about 30 min using a 100 keV beam. Treatment is accomplished by mounting the product on a cooled, tiltable, turntable which rotates continuously, or is indexed in 15° steps to expose different surfaces in fixed position. Product cooling is accomplished by using a chilled eutectic metal to mount and grip the variously shaped objects. A high voltage supply capable of 10 mA at 100 kV is used, and the equipment is microcomputer controlled via serial light links. All important machine parameters are presented in sequenced displays on a CRT. Uniformity of treatment and accumulated dose are monitored by a Faraday cup system which provides the microprocessor with data for display of time to completion on the process screen. For routine implants the operator requires only two buttons; one for chamber vacuum control, and the other for process start and stop.

  6. The XRS microcalorimeter spectrometer at the Livermore Electron Beam Ion Trap

    SciTech Connect

    Porter, F S; Beiersdorfer, P; Boyce, K; Brown, G V; Chen, H; Gygax, J; Kahn, S M; Kelley, R; Kilbourne, C A; Magee, E; Thorn, D B

    2007-08-22

    NASA's X-ray Spectrometer (XRS) microcalorimeter instrument has been operating at the Electron Beam Ion Trap (EBIT) facility at Lawrence Livermore National Laboratory since July of 2000. The spectrometer is currently undergoing its third major upgrade to become an easy to use, extremely high performance instrument for a broad range of EBIT experiments. The spectrometer itself is broadband, capable of simultaneously operating from 0.1 to 12 keV and has been operated at up to 100 keV by manipulating its operating conditions. The spectral resolution closely follows the spaceflight version of the XRS, beginning at 10 eV FWHM at 6 keV in 2000, upgraded to 5.5 eV in 2003, and will hopefully be {approx}3.8 eV in the Fall of 2007. Here we review the operating principles of this unique instrument, the extraordinary science that has been performed at EBIT over the last 6 years, and prospects for future upgrades. Specifically we discuss upgrades to cover the high-energy band (to at least 100 keV) with a high quantum efficiency detector, and prospects for using a new superconducting detector to reach 0.8 eV resolution at 1 keV, and 2 eV at 6 keV with high counting rates.

  7. A high-current microwave ion source with permanent magnet and its beam emittance measurement

    SciTech Connect

    Yao Zeen; Tan Xinjian; Du Hongxin; Luo Ben; Liu Zhanwen

    2008-07-15

    The progress of a 2.45 GHz high-current microwave ion source with permanent magnet for T(d,n){sup 4}He reaction neutron generator is reported in this paper. At 600 W microwave power and 22 kV extraction voltage, 90 mA peak hydrogen ion beam is extracted from a single aperture of 6 mm diameter. The beam emittance is measured using a simplified pepper-pot method. The (x,x{sup '}) emittance and the (y,y{sup '}) emittance for 14 keV hydrogen ion beam are 55.3{pi} and 58.2{pi} mm mrad, respectively. The normalized emittances are 0.302{pi} and 0.317{pi} mm mrad, respectively.

  8. NSUF Ion Beam Investment Options Workshop Report

    SciTech Connect

    Heidrich, Brenden John

    2016-03-01

    The workshop that generated this data was convened to develop a set of recommendations (a priority list) for possible funding in the area of US domestic ion beam irradiation capabilities for nuclear energy-focused RD&D. The results of this workshop were intended for use by the Department of Energy - Office of Nuclear Energy (DOE-NE) for consideration of support for these facilities. The workshop considered, as part of the initial potential future support discussions, input submitted through the Office of Nuclear Energy Request for Information (RFI) (DE-SOL-0008318, April 13, 2015), but welcomed discussion (and presentation) of other options, whether specific or general in scope. Input from users, including DOE-NE program interests and needs for ion irradiation RD&D were also included. Participants were selected from various sources: RFI respondents, NEUP/NEET infrastructure applicants, universities with known expertise in nuclear engineering and materials science and other developed sources. During the three days from March 22-24, 2016, the workshop was held at the Idaho National Laboratory Meeting Center in the Energy Innovation Laboratory at 775 University Drive, Idaho Falls, ID 83401. Thirty-one members of the ion beam community attended the workshop, including 15 ion beam facilities, six representatives of Office of Nuclear Energy R&D programs, an industry representative from EPRI and the chairs of the NSUF User’s Organization and the NSUF Scientific Review Board. Another four ion beam users were in attendance acting as advisors to the process, but did not participate in the options assessment. Three members of the sponsoring agency, the Office of Science and Technology Innovation (NE-4) also attended the workshop.

  9. Ion source studies for particle beam accelerators

    SciTech Connect

    Bieg, K.W.; Burns, E.J.T.; Olsen, J.N.; Dorrell, L.R.

    1985-05-01

    High power particle beam accelerators are being developed for use in inertial confinement fusion applications. These pulsed power accelerators require sources of low atomic number ions (e.g., protons, deuterons, carbon, or lithium). The sources must be of high purity for efficient accelerator operation and proper target coupling, must have a rapid ''turn-on,'' and must be compatible with ion diode configurations under development. A particular type of source presently being investigated is the flashover ion source which generates ions by means of the vacuum flashover of an insulating anode material when the high voltage pulse arrives at the diode. We have developed an applied-magnetic-field, extraction ion diode for the 0.03 TW Nereus accelerator specifically to investigate these sources. Extracted ion species are measured by means of a Thomson-parabola ion analyzer, dB/dt current monitors, and Faraday cups. Experiments have been performed to investigate the surface flashover mechanism and the effects of various dielectric source materials, anode preparation methods (including rf glow discharge cleaning), and vacuum conditions on ion species and diode operation.

  10. Kinetic energy releases of small amino acids upon interaction with keV ions

    NASA Astrophysics Data System (ADS)

    Bari, S.; Alvarado, F.; Postma, J.; Sobocinski, P.; Hoekstra, R.; Schlathölter, T.

    2009-01-01

    In chromatin, DNA is tightly packed into one complex together with histone and non-histone proteins. These proteins are known to protect the DNA against indirect and to some extent even direct radiation damage. Radiation action upon amino acids is thus one of the primary steps in biological radiation action. In this paper we investigate the ionization and fragmentation of the gas-phase amino acids glycine, alanine and valine upon interaction with keV α-particles. High resolution coincidence time-of-flight mass spectrometry is used to determine the dominant fragmentation channels as well as fragment kinetic energies.

  11. Helium ion beam enhanced local etching of silicon nitride

    SciTech Connect

    Petrov, Yu. V. Sharov, T. V.; Baraban, A. P.

    2016-06-17

    We investigated the effect of the helium ion implantation on the etching rate of silicon nitride in hydrofluoric acid. Helium ions were implanted into 500-nm-thick silicon nitride film with energies from 15 keV to 35 keV. The ion fluence from 10{sup 14} cm{sup −2} to 10{sup 17} cm{sup −2} was used. All samples were investigated with a scanning electron microscope and atomic force microscope. The dependence of the etching rate on the concentration of ion-induced defects is obtained.

  12. Transfer Casting From Ion-Beam-Textured Surfaces

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Sovey, J. S.

    1986-01-01

    Textured surfaces created on metals, ceramics, and polymers. Electron-bombardment ion thrustor used as neutralized-ion-beam source. Beam of directed, energetic ions alter surface chemistry and/or morphology of many materials. By adjusting ion energy and ion-beam current density impinging upon target, precise surface modifications obtained without risk of targetmaterial melting or bulk decomposition. Technique developed to generate precise, controllable, surface microstructures on metals, ceramics, and polymers.

  13. Transfer Casting From Ion-Beam-Textured Surfaces

    NASA Technical Reports Server (NTRS)

    Banks, B. A.; Weigand, A. J.; Sovey, J. S.

    1986-01-01

    Textured surfaces created on metals, ceramics, and polymers. Electron-bombardment ion thrustor used as neutralized-ion-beam source. Beam of directed, energetic ions alter surface chemistry and/or morphology of many materials. By adjusting ion energy and ion-beam current density impinging upon target, precise surface modifications obtained without risk of targetmaterial melting or bulk decomposition. Technique developed to generate precise, controllable, surface microstructures on metals, ceramics, and polymers.

  14. Ion beam modification of aromatic polymers

    NASA Astrophysics Data System (ADS)

    Shukushima, Satoshi; Nishikawa, Shinya; Matsumoto, Yasuyo; Hibino, Yutaka

    1993-06-01

    We studied the optical, mechanical and thermal properties of aromatic polymer films which had been irradiated with 1 MeV H +, H 2+ and He + ions. The examined aromatic polymers were polyetherether ketone (PEEK), polyetherimide (PEI), polycther sulfon (PES), polysulfon (PSF), and polyphenylene sulfide (PPS). The optical densities at 300 nm of PES greatly increased after the irradiation. The optical densities at 400 nm of all the examined polymer linearly increased with the irradiation dose. Elongations of all the polymers at room temperature were reduced after irradiation. The PEEK film which had been irradiated with 1 MeV H + was not deformed above the melting point. This demonstrates that cross-linking occurs in PEEK films by ion beam irradiation. As for the effects, depending on the mass of the irradiated ions, it was found that the ions with a high mass induced larger effects on the arematic polymers for the same absorption energy.

  15. Influence of 400 keV carbon ion implantation on structural, optical and electrical properties of PMMA

    NASA Astrophysics Data System (ADS)

    Arif, Shafaq; Rafique, M. Shahid; Saleemi, Farhat; Sagheer, Riffat; Naab, Fabian; Toader, Ovidiu; Mahmood, Arshad; Rashid, Rashad; Mahmood, Mazhar

    2015-09-01

    Ion implantation is a useful technique to modify surface properties of polymers without altering their bulk properties. The objective of this work is to explore the 400 keV C+ ion implantation effects on PMMA at different fluences ranging from 5 × 1013 to 5 × 1015 ions/cm2. The surface topographical examination of irradiated samples has been performed using Atomic Force Microscope (AFM). The structural and chemical modifications in implanted PMMA are examined by Raman and Fourier Infrared Spectroscopy (FTIR) respectively. The effects of carbon ion implantation on optical properties of PMMA are investigated by UV-Visible spectroscopy. The modifications in electrical conductivity have been measured using a four point probe technique. AFM images reveal a decrease in surface roughness of PMMA with an increase in ion fluence from 5 × 1014 to 5 × 1015 ions/cm2. The existence of amorphization and sp2-carbon clusterization has been confirmed by Raman and FTIR spectroscopic analysis. The UV-Visible data shows a prominent red shift in absorption edge as a function of ion fluence. This shift displays a continuous reduction in optical band gap (from 3.13 to 0.66 eV) due to formation of carbon clusters. Moreover, size of carbon clusters and photoconductivity are found to increase with increasing ion fluence. The ion-induced carbonaceous clusters are believed to be responsible for an increase in electrical conductivity of PMMA from (2.14 ± 0.06) × 10-10 (Ω-cm)-1 (pristine) to (0.32 ± 0.01) × 10-5 (Ω-cm)-1 (irradiated sample).

  16. Development of a plasma generator for a long pulse ion source for neutral beam injectors

    SciTech Connect

    Watanabe, K.; Dairaku, M.; Tobari, H.; Kashiwagi, M.; Inoue, T.; Hanada, M.; Jeong, S. H.; Chang, D. H.; Kim, T. S.; Kim, B. R.; Seo, C. S.; Jin, J. T.; Lee, K. W.; In, S. R.; Oh, B. H.; Kim, J.; Bae, Y. S.

    2011-06-15

    A plasma generator for a long pulse H{sup +}/D{sup +} ion source has been developed. The plasma generator was designed to produce 65 A H{sup +}/D{sup +} beams at an energy of 120 keV from an ion extraction area of 12 cm in width and 45 cm in length. Configuration of the plasma generator is a multi-cusp bucket type with SmCo permanent magnets. Dimension of a plasma chamber is 25 cm in width, 59 cm in length, and 32.5 cm in depth. The plasma generator was designed and fabricated at Japan Atomic Energy Agency. Source plasma generation and beam extraction tests for hydrogen coupling with an accelerator of the KSTAR ion source have been performed at the KSTAR neutral beam test stand under the agreement of Japan-Korea collaborative experiment. Spatial uniformity of the source plasma at the extraction region was measured using Langmuir probes and {+-}7% of the deviation from an averaged ion saturation current density was obtained. A long pulse test of the plasma generation up to 200 s with an arc discharge power of 70 kW has been successfully demonstrated. The arc discharge power satisfies the requirement of the beam production for the KSTAR NBI. A 70 keV, 41 A, 5 s hydrogen ion beam has been extracted with a high arc efficiency of 0.9 -1.1 A/kW at a beam extraction experiment. A deuteron yield of 77% was measured even at a low beam current density of 73 mA/cm{sup 2}.

  17. Slowing down of an ion beam in a background plasma

    NASA Astrophysics Data System (ADS)

    Newsham, D.; Ross, T. J.; Rynn, N.

    1996-07-01

    The slowing down of a barium ion beam into two different plasma backgrounds was measured using laser-induced fluorescence. The measurements were performed in a Q machine (Ti=Te=0.2 eV, 6×1010≤nback≤1.2×1010 cm-3), where a barium ion beam, with energy 0-40 eV, was injected, parallel to the confining magnetic field, into both a cesium and a lithium plasma. In order to treat the ion beam as a class of test particles, the ion beam density was maintained at approximately two orders of magnitude below the density of the background plasma. Measured changes in the velocity profile of the ion beam agrees well with the predictions of the Fokker-Planck for both nearly equal mass beam and background ions as well as for a background ion with approximately 1/20th the mass of the beam ion.

  18. Time resolved ion beam induced charge collection

    SciTech Connect

    SEXTON,FREDERICK W.; WALSH,DAVID S.; DOYLE,BARNEY L.; DODD,PAUL E.

    2000-04-01

    Under this effort, a new method for studying the single event upset (SEU) in microelectronics has been developed and demonstrated. Called TRIBICC, for Time Resolved Ion Beam Induced Charge Collection, this technique measures the transient charge-collection waveform from a single heavy-ion strike with a {minus}.03db bandwidth of 5 GHz. Bandwidth can be expanded up to 15 GHz (with 5 ps sampling windows) by using an FFT-based off-line waveform renormalization technique developed at Sandia. The theoretical time resolution of the digitized waveform is 24 ps with data re-normalization and 70 ps without re-normalization. To preserve the high bandwidth from IC to the digitizing oscilloscope, individual test structures are assembled in custom high-frequency fixtures. A leading-edge digitized waveform is stored with the corresponding ion beam position at each point in a two-dimensional raster scan. The resulting data cube contains a spatial charge distribution map of up to 4,096 traces of charge (Q) collected as a function of time. These two dimensional traces of Q(t) can cover a period as short as 5 ns with up to 1,024 points per trace. This tool overcomes limitations observed in previous multi-shot techniques due to the displacement damage effects of multiple ion strikes that changed the signal of interest during its measurement. This system is the first demonstration of a single-ion transient measurement capability coupled with spatial mapping of fast transients.

  19. Field-aligned beams of energetic electrons (16 keVless than or equal toEless than or equal to80 keV) observed at geosynchronous orbit at substorm onsets

    SciTech Connect

    Kremser, G.; Korth, A.; Ullaland, S.L.; Perraut, S.; Roux, A.; Pedersen, A.; Schmidt, R.; Tanskanen, P.

    1988-12-01

    Magnetospheric substorms start with strong temporal and spatial variations of a large number of magnetospheric parameters. We report on the occurrence of bidirectional field-aligned beams of energetic electrons (16 keVless than or equal toEless than or equal to80 keV) that were observed on the geosynchronous satellite GEOS 2. The electron beams appear about 4 min after the onset of the substorm expansion phase and last about 1.5 min. They are associated with strong spatial gradients of the ion intensity and fluctuations of the geoelectric and geomagnetic fields. The beams are interpreted as the result of an acceleration of electrons in the parallel electric field of kinetic Alfven waves. It is assumed that these waves are generated by mode conversion from a surface wave that is generated by a magnetohydrodynamic instability in the transition region between dipolelike and taillike geomagnetic field lines. copyright American Geophysical Union 1988

  20. Spectrometer for cluster ion beam induced luminescence

    SciTech Connect

    Ryuto, H. Sakata, A.; Takeuchi, M.; Takaoka, G. H.; Musumeci, F.

    2015-02-15

    A spectrometer to detect the ultra-weak luminescence originated by the collision of cluster ions on the surfaces of solid materials was constructed. This spectrometer consists of 11 photomultipliers with band-pass interference filters that can detect the luminescence within the wavelength ranging from 300 to 700 nm and of a photomultiplier without filter. The calibration of the detection system was performed using the photons emitted from a strontium aluminate fluorescent tape and from a high temperature tungsten filament. Preliminary measurements show the ability of this spectrometer to detect the cluster ion beam induced luminescence.

  1. Decaborane beam from ITEP Bernas ion source

    SciTech Connect

    Kulevoy, T.V.; Petrenko, S.V.; Kuibeda, R.P.; Batalin, V.A.; Pershin, V.I.; Koslov, A.V.; Stasevich, Yu.B.; Hershcovitch, A.; Johnson, B.M.; Oks, E.M.; Gushenets, V.I.; Poole, H.J.; Storozhenko, P.A.; Gurkova, E.L.; Alexeyenko, O.V.

    2006-03-15

    A joint research and development program is under way to develop steady-state intense ion sources for the two energy extremes of MeV and hundreds of eV. The difficulties of extraction and transportation of low-energy boron beams are investigated using a decaborane compound [I. Yamada, W. L. Brown, J. A. Northby, and M. Sosnowski, Nucl. Instrum. Methods Phys. Res. B 79, 223 (1993)]. Presented here are the results from ITEP experiments using the Bernas ion source with an indirectly heated LaB{sub 6} cathode.

  2. Long-term stable transmission of 3-keV Ne7+ ions guided through nanocapillaries in polymers

    NASA Astrophysics Data System (ADS)

    Stolterfoht, N.; Herczku, P.; Juhász, Z.; Kovács, S. T. S.; Rácz, R.; Biri, S.; Sulik, B.

    2016-11-01

    We studied blocking effects on 3-keV Ne7+ ion guiding through nanocapillaries in highly insulating polyethylene terephthalate (PET) manufactured at different laboratories. The experiments were motivated in view of previous measurement with PET capillaries prepared at the GSI Helmholtz-Zentrum for which significant blocking effects were observed, whereas in various previous studies with PET capillaries these effects could not be detected. As the blocking effect on the GSI capillaries strongly depends on their areal density, similar dependencies were studied with the FLNR capillaries. Long-term stable transmission was observed for all densities of the FLNR capillaries in contrast to the previous results. These observations are interpreted by differences in the capillary surface conductivities in accordance with charge patch formations within the capillaries. It is pointed out that the observed stable transmission is favorable for applications of ion guiding in capillaries.

  3. Recombination characteristics of therapeutic ion beams on ion chamber dosimetry

    NASA Astrophysics Data System (ADS)

    Matsufuji, Naruhiro; Matsuyama, Tetsuharu; Sato, Shinji; Kohno, Toshiyuki

    2016-09-01

    In heavy ion radiotherapy, ionization chambers are regarded as a standard for determining the absorbed dose given to patients. In ion dosimetry, it is necessary to correct the radiation quality, which depends on the initial recombination effect. This study reveals for the radiation quality dependence of the initial recombination in air in ion dosimetry. Ionization charge was measured for the beams of protons at 40-160 MeV, carbon at 21-400 MeV/n, and iron at 23.5-500 MeV/n using two identical parallel-plate ionization chambers placed in series along the beam axis. The downstream chamber was used as a monitor operated with a constant applied voltage, while the other chamber was used for recombination measurement by changing the voltage. The ratio of the ionization charge measured by the two ionization chambers showed a linear relationship with the inverse of the voltage in the high-voltage region. The initial recombination factor was estimated by extrapolating the obtained linear relationship to infinite voltage. The extent of the initial recombination was found to increase with decreasing incident energy or increasing atomic number of the beam. This behavior can be explained with an amorphous track structure model: the increase of ionization density in the core region of the track due to decreasing kinetic energy or increasing atomic number leads to denser initial ion production and results in a higher recombination probability. For therapeutic carbon ion beams, the extent of the initial recombination was not constant but changed by 0.6% even in the target region. This tendency was quantitatively well reproduced with the track-structure based on the initial recombination model; however, the transitional change in the track structure is considered to play an important role in further understanding of the characteristics of the initial recombination.

  4. Dependence of 50-keV upstream ion events at IMP 7 and 8 upon magnetic field bow shock geometry

    NASA Technical Reports Server (NTRS)

    Mitchell, D. G.; Roelof, E. C.

    1983-01-01

    Results are presented for a statistical study of four years (1972-1976) of IMP 7 and 8 observations at approximately 40 R(E) of 50-200 keV upstream ion events measured with the Energetic Particle Experiment. A monotonic increase in the probability of observing upstream particle events is found with a decrease in the angle (theta-Bn) between the interplanetary magnetic field (IMF) and the local shock normal at the point where the IMF intersects the bow shock, independent of the length of time of bow shock connections exceeding approximately 10 min. Approximately equal probabilities are found for observing an event above a given flux from any portion of the bow shock with the same value of theta-Bn, a growth time of the 50-200 keV events of approximately 10 min, a maximum attainable flux of approximately 25,000/sq cm s sr, and a positive correlation between the probability of exceeding a given flux and the 3 hr Kp index. It is concluded that the local structure of the bow shock in the immediate vicinity of the field line connection is the dominant influence in the generation process of energetic upstream particle events and that wave-particle interactions produce a self-throttling mechanism that limits the maximum flux of ions escaping the upstream foreshock.

  5. Classical physics impossibility of magnetic fusion reactor with neutral beam injection at thermonuclear energies below 200 KeV

    NASA Astrophysics Data System (ADS)

    Maglich, Bogdan; Hester, Timothy; Vaucher, Alexander

    2016-10-01

    Lawson criterion was specifically derived for inertial fusion and DT gas of stable lifetime without ions and magnetic fields. It was revised with realistic parametrers. To account for the losses of unstable ions against neutralization with lifetime τ, n (t) = nτ [ 1 - exp (- t / - tτ τ) ] -> nτ for τ << t , where τ-1 =n0 [ ERR : md : MbegChr = 0 x 2329 , MendChr = 0 x 232 A , nParams = 1 ] , residual gas density. Second revised criterion becomes: ntL =1014cm-3 s , tL = Lawson conf. time becomes nτtL =1014 orntL =1016 / τ . In CT resonance regime below critical energy To, τ 10-5 , and Lawson requirement ntL 1021 i.e. not realistic. Luminosity (reaction rate for σ = 1) is that of two unstable particles each with lifetime τ: L =n2(t)v12 =n2t2v12 . In subcritical regime, L =10-10n2 forn =1014cm-3 , v 109 cms-1 = L =1027 . Which is negligible and implies a negative power flow reactor. But above T0 , atTD = 725 KeV , τ = 20 s was observed implying L =1039 i.e. massive fusion energy production.

  6. Dispensing targets for ion beam particle generators

    NASA Technical Reports Server (NTRS)

    Miller, C. G. (Inventor)

    1974-01-01

    A target for dispensing high energy protons or neutrons or ionized atoms or ionized molecules is provided which comprises a container for the target gas, which is at atmospheric or higher pressure. The container material can release the target gas in the spot where the container is heated above a predetermined temperature by the impact of an ion beam where protons or neutrons are desired, or by electrons where ionized atoms or molecules are desired. On the outside of the container, except for the region where the beam is to impact, there is deposited a layer of a metal which is imperious to gaseous diffusion. A further protective coating of a material is placed over the layer of metal, except at the region of the ion impact area in order to adsorb any unreacted gas in the vacuum in which the target is placed, to thereby prevent reduction of the high vacuum, as well as contamination of the interior of the vacuum chamber.

  7. Ion-beam-assisted etching of diamond

    NASA Technical Reports Server (NTRS)

    Efremow, N. N.; Geis, M. W.; Flanders, D. C.; Lincoln, G. A.; Economou, N. P.

    1985-01-01

    The high thermal conductivity, low RF loss, and inertness of diamond make it useful in traveling wave tubes operating in excess of 500 GHz. Such use requires the controlled etching of type IIA diamond to produce grating like structures tens of micrometers deep. Previous work on reactive ion etching with O2 gave etching rates on the order of 20 nm/min and poor etch selectivity between the masking material (Ni or Cr) and the diamond. An alternative approach which uses a Xe(+) beam and a reactive gas flux of NO2 in an ion-beam-assisted etching system is reported. An etching rate of 200 nm/min was obtained with an etching rate ratio of 20 between the diamond and an aluminum mask.

  8. Measurement of ultra-low ion energy of decelerated ion beam using a deflecting electric field

    NASA Astrophysics Data System (ADS)

    Thopan, P.; Suwannakachorn, D.; Tippawan, U.; Yu, L. D.

    2015-12-01

    In investigation on ultra-low-energy ion bombardment effect on DNA, an ion beam deceleration lens was developed for high-quality ultra-low-energy ion beam. Measurement of the ion energy after deceleration was necessary to confirm the ion beam really decelerated as theoretically predicted. In contrast to conventional methods, this work used a simple deflecting electrostatic field after the deceleration lens to bend the ion beam. The beam bending distance depended on the ion energy and was described and simulated. A system for the measurement of the ion beam energy was constructed. It consisted of a pair of parallel electrode plates to generate the deflecting electrical field, a copper rod measurement piece to detect ion beam current, a vernier caliper to mark the beam position, a stepping motor to translate the measurement rod, and a webcam-camera to read the beam bending distance. The entire system was installed after the ion-beam deceleration lens inside the large chamber of the bioengineering vertical ion beam line. Moving the measurement rod across the decelerated ion beam enabled to obtain beam profiles, from which the beam bending distance could be known and the ion beam energy could be calculated. The measurement results were in good agreement with theoretical and simulated results.

  9. Simulation of ion beam injection and extraction in an EBIS.

    PubMed

    Zhao, L; Kim, J S

    2016-02-01

    An example simulation of Au+ charge breeding using FAR-TECH's integrated EBIS (electron beam ion source) modeling toolset is presented with the emphasis on ion beam injection and extraction. The trajectories of injected ions are calculated with PBGUNS (particle beam gun simulation) self-consistently by including the space charges from both ions and electrons. The ion beam, starting with initial conditions within the 100% acceptance of the electron beam, is then tracked by EBIS-PIC (particle-in-cell EBIS simulation code). In the trap, the evolution of the ion charge state distribution is estimated by charge state estimator. The extraction of charge bred ions is simulated with PBGUNS. The simulations of the ion injections show significant ion space charge effects on beam capture efficiency and the ionization efficiency.

  10. Simulation of ion beam injection and extraction in an EBIS

    NASA Astrophysics Data System (ADS)

    Zhao, L.; Kim, J. S.

    2016-02-01

    An example simulation of Au+ charge breeding using FAR-TECH's integrated EBIS (electron beam ion source) modeling toolset is presented with the emphasis on ion beam injection and extraction. The trajectories of injected ions are calculated with PBGUNS (particle beam gun simulation) self-consistently by including the space charges from both ions and electrons. The ion beam, starting with initial conditions within the 100% acceptance of the electron beam, is then tracked by EBIS-PIC (particle-in-cell EBIS simulation code). In the trap, the evolution of the ion charge state distribution is estimated by charge state estimator. The extraction of charge bred ions is simulated with PBGUNS. The simulations of the ion injections show significant ion space charge effects on beam capture efficiency and the ionization efficiency.

  11. Simulation of ion beam injection and extraction in an EBIS

    SciTech Connect

    Zhao, L. Kim, J. S.

    2016-02-15

    An example simulation of Au+ charge breeding using FAR-TECH’s integrated EBIS (electron beam ion source) modeling toolset is presented with the emphasis on ion beam injection and extraction. The trajectories of injected ions are calculated with PBGUNS (particle beam gun simulation) self-consistently by including the space charges from both ions and electrons. The ion beam, starting with initial conditions within the 100% acceptance of the electron beam, is then tracked by EBIS-PIC (particle-in-cell EBIS simulation code). In the trap, the evolution of the ion charge state distribution is estimated by charge state estimator. The extraction of charge bred ions is simulated with PBGUNS. The simulations of the ion injections show significant ion space charge effects on beam capture efficiency and the ionization efficiency.

  12. Design study of primary ion provider for relativistic heavy ion collider electron beam ion source.

    PubMed

    Kondo, K; Kanesue, T; Tamura, J; Okamura, M

    2010-02-01

    Brookhaven National Laboratory has developed the new preinjector system, electron beam ion source (EBIS) for relativistic heavy ion collider (RHIC) and National Aeronautics and Space Administration Space Radiation Laboratory. Design of primary ion provider is an essential problem since it is required to supply beams with different ion species to multiple users simultaneously. The laser ion source with a defocused laser can provide a low charge state and low emittance ion beam, and is a candidate for the primary ion source for RHIC-EBIS. We show a suitable design with appropriate drift length and solenoid, which helps to keep sufficient total charge number with longer pulse length. The whole design of primary ion source, as well as optics arrangement, solid targets configuration and heating about target, is presented.

  13. Simulations and experiments of intense ion beam current density compression in space and timea)

    NASA Astrophysics Data System (ADS)

    Sefkow, A. B.; Davidson, R. C.; Gilson, E. P.; Kaganovich, I. D.; Anders, A.; Coleman, J. E.; Leitner, M.; Lidia, S. M.; Roy, P. K.; Seidl, P. A.; Waldron, W. L.; Yu, S. S.; Welch, D. R.

    2009-05-01

    The Heavy Ion Fusion Science Virtual National Laboratory has achieved 60-fold longitudinal pulse compression of ion beams on the Neutralized Drift Compression Experiment (NDCX) [P. K. Roy et al., Phys. Rev. Lett. 95, 234801 (2005)]. To focus a space-charge-dominated charge bunch to sufficiently high intensities for ion-beam-heated warm dense matter and inertial fusion energy studies, simultaneous transverse and longitudinal compression to a coincident focal plane is required. Optimizing the compression under the appropriate constraints can deliver higher intensity per unit length of accelerator to the target, thereby facilitating the creation of more compact and cost-effective ion beam drivers. The experiments utilized a drift region filled with high-density plasma in order to neutralize the space charge and current of an ˜300 keV K+ beam and have separately achieved transverse and longitudinal focusing to a radius <2 mm and pulse duration <5 ns, respectively. Simulation predictions and recent experiments demonstrate that a strong solenoid (Bz<100 kG) placed near the end of the drift region can transversely focus the beam to the longitudinal focal plane. This paper reports on simulation predictions and experimental progress toward realizing simultaneous transverse and longitudinal charge bunch focusing. The proposed NDCX-II facility would capitalize on the insights gained from NDCX simulations and measurements in order to provide a higher-energy (>2 MeV) ion beam user-facility for warm dense matter and inertial fusion energy-relevant target physics experiments.

  14. A pepper-pot emittance meter for low-energy heavy-ion beams

    SciTech Connect

    Kremers, H. R.; Beijers, J. P. M.; Brandenburg, S.

    2013-02-15

    A novel emittance meter has been developed to measure the four-dimensional, transverse phase-space distribution of a low-energy ion beam using the pepper-pot technique. A characteristic feature of this instrument is that the pepper-pot plate, which has a linear array of holes in the vertical direction, is scanned horizontally through the ion beam. This has the advantage that the emittance can also be measured at locations along the beam line where the beam has a large horizontal divergence. A set of multi-channel plates, scintillation screen, and ccd camera is used as a position-sensitive ion detector allowing a large range of beam intensities that can be handled. This paper describes the design, construction, and operation of the instrument as well as the data analysis used to reconstruct the four-dimensional phase-space distribution of an ion beam. Measurements on a 15 keV He{sup +} beam are used as an example.

  15. Study of plasma confinement in ELMO Bumpy Torus with a heavy-ion beam probe

    SciTech Connect

    Bieniosek, F. M.

    1981-01-01

    Plasma confinement in ELMO Bumpy Torus (EBT) is generally strongly dependent on an ambipolar electric field. Spatially resolved measurements of the resulting electric space potential phi/sub sp/ have been made in a single plasma cross section by the heavy-ion beam probe. This diagnostic injects a 4-60-keV beam of (usually) Cs/sup +/ ions into the plasma. Measurement of the energy of Cs/sup 2 +/ secondary ions leaving the plasma gives a continuous monitor of the local space potential. In addition, the total detected Cs/sup 2 +/ ion current is proportional to the product of the local electron density and the ionization rate, which, in turn, is a function of the electron temperature. This signal, nf(T/sub e/), is sensitive to all three electron distributions found in EBT - those of the cold surface plasma, the warm core plasma, and the hot electron ring.

  16. Ion beam analysis of sialon ceramics

    NASA Astrophysics Data System (ADS)

    Vickridge, I. C.; Brown, I. W. M.; Ekström, T. C.; Trompetter, W. J.

    1996-09-01

    Sialons, or silicon-aluminium-oxy-nitrides, are a family of materials that have exceptional high temperature mechanical and tribological properties, but which are susceptible to oxidation. Ion beam analysis is an ideal tool to study the composition of the altered surface layer of sialons after oxidation. In particular simultaneous detection of gamma rays, charged particles, and X-rays induced by 1.4 MeV deuterons allows an almost complete picture of the composition to be obtained.

  17. Radioactive Ion Beams at INFN Laboratories

    SciTech Connect

    Calabretta, L.; Celona, L.; Chines, F.; Cosentino, L.; Cuttone, G.; Finocchiaro, P.; Maggiore, M.; Pappalardo, A.; Piazza, L.; Re, M.; Rifuggiato, D.; Rovelli, A.; Pappalardo, A.; Andrighetto, A.; Prete, G.; Biasetto, L.; Manzolaro, M.; Sarchiapone, L.; Galata, A.; Lombardi, A.

    2010-04-30

    The LNS and the LNL are the two laboratories of INFN devoted to the research on nuclear physics. Since the 1995 the LNS are involved in the design and construction of the Radioactive Ion Beam facilities called EXCYT. In the early of 2000 the LNL starts a project for second generation RIB facilities called SPES. In the 2004 at the LNS we start also the production of RIB by in flight fragmentation. Here the status and perspective of these three projects are presented.

  18. Beam Dynamics Considerations in Electron Ion Colliders

    NASA Astrophysics Data System (ADS)

    Krafft, Geoffrey

    2015-04-01

    The nuclear physics community is converging on the idea that the next large project after FRIB should be an electron-ion collider. Both Brookhaven National Lab and Thomas Jefferson National Accelerator Facility have developed accelerator designs, both of which need novel solutions to accelerator physics problems. In this talk we discuss some of the problems that must be solved and their solutions. Examples in novel beam optics systems, beam cooling, and beam polarization control will be presented. Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. The U.S. Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce this manuscript for U.S. Government purposes.

  19. Large area multiarc ion beam source {open_quote}MAIS{close_quote}

    SciTech Connect

    Engelko, V.; Giese, H.; Schalk, S.

    1996-12-31

    A pulsed large area intense ion beam source is described, in which the ion emitting plasma is built up by an array of individual discharge units, homogeneously distributed over the surface of a common discharge electrode. A particularly advantageous feature of the source is that for plasma generation and subsequent acceleration of the ions only one common energy supply is necessary. This allows to simplify the source design and provides inherent synchronization of plasma production and ion extraction. The homogeneity of the plasma density was found to be superior to plasma sources using plasma expanders. Originally conceived for the production of proton beams, the source can easily be modified for the production of beams composed of carbon and metal ions or mixed ion species. Results of investigations of the source performance for the production of a proton beam are presented. The maximum beam current achieved to date is of the order of 100 A, with a particle kinetic energy of 15 - 30 keV and a pulse length in the range of 10 {mu}s.

  20. Beam divergence characteristic of two-stage ion diode

    NASA Astrophysics Data System (ADS)

    Shirai, Nobutake; Yasuike, Kazuhito; Takahashi, Genji; Shomoto, Norihisa; Yamamoto, Kazuhiro; Imasaki, Kazuo; Yamanaka, Chiyoe; Miyamoto, Shuji; Nakai, Sadao

    1994-06-01

    The improvement of beam divergence by a two-stage diode is being studied at ILE Osaka University. We measured 750 keV carbon beam divergence by using a Shadow-Box with CR-39. We used the track analyzer (LUZEX III) that could measure and digitize the position of tracks, track diameter and shape of tracks to count a number of tracks on CR-39 and obtained results of beam divergence at first stage and second stage with track diameter resolution.

  1. Development of An Ion Beam Cooler and Buncher for the SCRIT

    NASA Astrophysics Data System (ADS)

    Togasaki, Mamoru; Enokizono, Akitomo; Kurita, Kazuyoshi; Matsuo, Saki; Hara, Masahiro; Hori, Toshitada; Ichikawa, Shin'ichi; Ohnishi, Tetsuya; Wakasugi, Masanori; Haraguchi, Yuji; Suda, Toshimi; Tamae, Tadaaki; Tsukada, Kyo; Tsuru, Teruaki; Yoneyama, Shunpei; Wang, Shuo

    2014-09-01

    The SCRIT (Self-Confining RI Ion Target) is an internal target forming technique for electron scattering off short lived unstable nuclei. In the SCRIT electron scattering facility at RIKEN RI Beam Factory, we constructed an ISOL-type RI beam generator named ERIS (Electron-beam-driven RI separator for SCRIT). ERIS supplys continuous RI ion beam with the energy of 50 keV at maximum. In order to efficiently inject the RI beam into SCRIT, it is necessary to provide a pulsed beam. Therefore, we are developing a cooler buncher system. The principle of this device is based on a linear radiofrequency quadrupole (RFQ) trap. Required performance for the device is to convert 1-s continuous beam into 500- μs pulsed beam with high efficiency. Experiment for the performance study is now going on using the stable 133Cs and 23Na ions. In this talk, we will report the latest status of the development and the study of the cooler buncher.

  2. "Fast" and "thick" e-beam resists exposed with multi-beam tool at 5 keV for implants and mature nodes: experimental and simulated model study

    NASA Astrophysics Data System (ADS)

    Fay, Aurélien; Thiam, Ndeye A.; Cordini, Marie-Laure; Servin, Isabelle; Constancias, Christophe; Lattard, Ludovic; Pain, Laurent

    2015-03-01

    In addition to sub-20 nm technology nodes, multi-beam lithography at low-energy has also the capability to address mature CMOS technologies [130-45nm nodes] with high throughput and significant manufacturing costs reduction. It requires both "fast" resists for throughput gain and cost of ownership and "thick" resists matched with the current post-lithography processes such as etching and implant steps. We successfully demonstrated patterning of 45-130 nm nodes structures on different thick resists (up to 160 nm) with a 5 keV Mapper pre-alpha tool. In parallel, we developed a theoretical model to simulate 3D patterning showing good agreement with our experimental results.

  3. Evaluation of a novel design for an electrostatic quadrupole triplet ion beam lens

    NASA Astrophysics Data System (ADS)

    Burns, L. R.; Bouas, J. D.; Matteson, S.; Weathers, D. L.

    2007-08-01

    We describe the design and evaluation of an electrostatic quadrupole triplet lens constructed to focus ion beams of up to 200 keV in energy. The lens is very compact and incorporates a feature to induce octupole fields that can correct for spherical and other octupole-order aberrations. Two methods were used to evaluate the lens: observation of the focused beam spot on a specially fabricated target while systematically varying lens voltages, and the grid-shadow technique. The latter demonstrated that octupole-order aberrations were completely corrected in one direction when the lens quadrupoles were operated individually and excited to produce an appropriate octupole component of the electric field.

  4. Evaluation of a Novel Design for an Electrostatic Quadrupole Triplet Ion Beam Lens

    NASA Astrophysics Data System (ADS)

    Burns, L. R.; Bouas, J. D.; Matteson, S.; Weathers, D. L.

    2006-10-01

    We describe the design and evaluation of an electrostatic quadrupole triplet lens constructed to focus ion beams of up to 200 keV in energy. The lens is very compact and incorporates a feature to induce octupole fields that can correct for spherical and other octupole-order aberrations. Two methods were used to evaluate the lens: observation of the focused beam spot on a specially fabricated target while systematically varying lens voltages, and the grid-shadow technique. The latter demonstrated that octupole-order aberrations were completely corrected in one direction when the lens quadrupoles were operated individually with appropriate octupole excitations.

  5. Study on space charge compensation in negative hydrogen ion beam.

    PubMed

    Zhang, A L; Peng, S X; Ren, H T; Zhang, T; Zhang, J F; Xu, Y; Guo, Z Y; Chen, J E

    2016-02-01

    Negative hydrogen ion beam can be compensated by the trapping of ions into the beam potential. When the beam propagates through a neutral gas, these ions arise due to gas ionization by the beam ions. However, the high neutral gas pressure may cause serious negative hydrogen ion beam loss, while low neutral gas pressure may lead to ion-ion instability and decompensation. To better understand the space charge compensation processes within a negative hydrogen beam, experimental study and numerical simulation were carried out at Peking University (PKU). The simulation code for negative hydrogen ion beam is improved from a 2D particle-in-cell-Monte Carlo collision code which has been successfully applied to H(+) beam compensated with Ar gas. Impacts among ions, electrons, and neutral gases in negative hydrogen beam compensation processes are carefully treated. The results of the beam simulations were compared with current and emittance measurements of an H(-) beam from a 2.45 GHz microwave driven H(-) ion source in PKU. Compensation gas was injected directly into the beam transport region to modify the space charge compensation degree. The experimental results were in good agreement with the simulation results.

  6. Study on space charge compensation in negative hydrogen ion beam

    SciTech Connect

    Zhang, A. L.; Chen, J. E.; Peng, S. X. Ren, H. T.; Zhang, T.; Zhang, J. F.; Xu, Y.; Guo, Z. Y.

    2016-02-15

    Negative hydrogen ion beam can be compensated by the trapping of ions into the beam potential. When the beam propagates through a neutral gas, these ions arise due to gas ionization by the beam ions. However, the high neutral gas pressure may cause serious negative hydrogen ion beam loss, while low neutral gas pressure may lead to ion-ion instability and decompensation. To better understand the space charge compensation processes within a negative hydrogen beam, experimental study and numerical simulation were carried out at Peking University (PKU). The simulation code for negative hydrogen ion beam is improved from a 2D particle-in-cell-Monte Carlo collision code which has been successfully applied to H{sup +} beam compensated with Ar gas. Impacts among ions, electrons, and neutral gases in negative hydrogen beam compensation processes are carefully treated. The results of the beam simulations were compared with current and emittance measurements of an H{sup −} beam from a 2.45 GHz microwave driven H{sup −} ion source in PKU. Compensation gas was injected directly into the beam transport region to modify the space charge compensation degree. The experimental results were in good agreement with the simulation results.

  7. Development of the Holifield Radioactive Ion Beam Facility

    NASA Astrophysics Data System (ADS)

    Tatum, B. A.; Alton, G. D.; Auble, R. L.; Beene, J. R.; Dowling, D. T.; Haynes, D. L.; Juras, R. C.; Meigs, M. J.; Mills, G. D.; Mosko, S. W.; Mueller, P. E.; Olsen, D. K.; Shapira, D.; Sinclair, J. W.; Carter, H. K.; Welton, R. F.; Williams, C. E.; Bailey, J. D.; Stracener, D. W.

    1997-05-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) construction project has been completed and the first radioactive ion beam has been successfully accelerated. The project, which began in 1992, has involved numerous facility modifications. The Oak Ridge Isochronous Cyclotron has been converted from an energy booster for heavy ion beams to a light ion accelerator with internal ion source. A target-ion source and mass analysis system have been commissioned as key components of the facility's radioactive ion beam injector to the 25MV tandem electrostatic accelerator. Beam transport lines have been completed, and new diagnostics for very low intensity beams have been developed. Work continues on a unified control system. Development of research quality radioactive beams for the nuclear structure and nuclear astrophysics communities continues. The HRIBF was formally dedicated on December 12, 1996, and approved for high intensity operation as a National User Facility, the first of its kind in North America. This paper describes facility development to date.

  8. Development of the Holifield Radioactive Ion Beam Facility

    SciTech Connect

    Tatum, B.A.

    1997-08-01

    The Holifield Radioactive Ion Beam Facility (HRIBF) construction project has been completed and the first radioactive ion beam has been successfully accelerated. The project, which began in 1992, has involved numerous facility modifications. The Oak Ridge Isochronous Cyclotron has been converted from an energy booster for heavy ion beams to a light ion accelerator with internal ion source. A target-ion source and mass analysis system have been commissioned as key components of the facility`s radioactive ion beam injector to the 25MV tandem electrostatic accelerator. Beam transport lines have been completed, and new diagnostics for very low intensity beams have been developed. Work continues on a unified control system. Development of research quality radioactive beams for the nuclear structure and nuclear astrophysics communities continues. This paper details facility development to date.

  9. Energy deposition of H and He ion beams in hydroxyapatite films: A study with implications for ion-beam cancer therapy

    NASA Astrophysics Data System (ADS)

    Limandri, Silvina; de Vera, Pablo; Fadanelli, Raul C.; Nagamine, Luiz C. C. M.; Mello, Alexandre; Garcia-Molina, Rafael; Behar, Moni; Abril, Isabel

    2014-02-01

    Ion-beam cancer therapy is a promising technique to treat deep-seated tumors; however, for an accurate treatment planning, the energy deposition by the ions must be well known both in soft and hard human tissues. Although the energy loss of ions in water and other organic and biological materials is fairly well known, scarce information is available for the hard tissues (i.e., bone), for which the current stopping power information relies on the application of simple additivity rules to atomic data. Especially, more knowledge is needed for the main constituent of human bone, calcium hydroxyapatite (HAp), which constitutes 58% of its mass composition. In this work the energy loss of H and He ion beams in HAp films has been obtained experimentally. The experiments have been performed using the Rutherford backscattering technique in an energy range of 450-2000 keV for H and 400-5000 keV for He ions. These measurements are used as a benchmark for theoretical calculations (stopping power and mean excitation energy) based on the dielectric formalism together with the MELF-GOS (Mermin energy loss function-generalized oscillator strength) method to describe the electronic excitation spectrum of HAp. The stopping power calculations are in good agreement with the experiments. Even though these experimental data are obtained for low projectile energies compared with the ones used in hadron therapy, they validate the mean excitation energy obtained theoretically, which is the fundamental quantity to accurately assess energy deposition and depth-dose curves of ion beams at clinically relevant high energies. The effect of the mean excitation energy choice on the depth-dose profile is discussed on the basis of detailed simulations. Finally, implications of the present work on the energy loss of charged particles in human cortical bone are remarked.

  10. Influence of organic ions on DNA damage induced by 1 eV to 60 keV electrons.

    PubMed

    Zheng, Yi; Sanche, Léon

    2010-10-21

    We report the results of a study on the influence of organic salts on the induction of single strand breaks (SSBs) and double strand breaks (DSBs) in DNA by electrons of 1 eV to 60 keV. Plasmid DNA films are prepared with two different concentrations of organic salts, by varying the amount of the TE buffer (Tris-HCl and EDTA) in the films with ratio of 1:1 and 6:1 Tris ions to DNA nucleotide. The films are bombarded with electrons of 1, 10, 100, and 60 000 eV under vacuum. The damage to the 3197 base-pair plasmid is analyzed ex vacuo by agarose gel electrophoresis. The highest yields are reached at 100 eV and the lowest ones at 60 keV. The ratios of SSB to DSB are surprisingly low at 10 eV (∼4.3) at both salt concentrations, and comparable to the ratios measured with 100 eV electrons. At all characteristic electron energies, the yields of SSB and DSB are found to be higher for the DNA having the lowest salt concentration. However, the organic salts are more efficient at protecting DNA against the damage induced by 1 and 10 eV electrons. DNA damage and protection by organic ions are discussed in terms of mechanisms operative at each electron energy. It is suggested that these ions create additional electric fields within the groove of DNA, which modify the resonance parameter of 1 and 10 eV electrons, namely, by reducing the electron capture cross-section of basic DNA units and the lifetime of corresponding transient anions. An interstrand electron transfer mechanism is proposed to explain the low ratios for the yields of SSB to those of DSB produced by 10 eV electrons.

  11. Influence of organic ions on DNA damage induced by 1 eV to 60 keV electrons

    SciTech Connect

    Zheng Yi; Sanche, Leon

    2010-10-21

    We report the results of a study on the influence of organic salts on the induction of single strand breaks (SSBs) and double strand breaks (DSBs) in DNA by electrons of 1 eV to 60 keV. Plasmid DNA films are prepared with two different concentrations of organic salts, by varying the amount of the TE buffer (Tris-HCl and EDTA) in the films with ratio of 1:1 and 6:1 Tris ions to DNA nucleotide. The films are bombarded with electrons of 1, 10, 100, and 60 000 eV under vacuum. The damage to the 3197 base-pair plasmid is analyzed ex vacuo by agarose gel electrophoresis. The highest yields are reached at 100 eV and the lowest ones at 60 keV. The ratios of SSB to DSB are surprisingly low at 10 eV ({approx}4.3) at both salt concentrations, and comparable to the ratios measured with 100 eV electrons. At all characteristic electron energies, the yields of SSB and DSB are found to be higher for the DNA having the lowest salt concentration. However, the organic salts are more efficient at protecting DNA against the damage induced by 1 and 10 eV electrons. DNA damage and protection by organic ions are discussed in terms of mechanisms operative at each electron energy. It is suggested that these ions create additional electric fields within the groove of DNA, which modify the resonance parameter of 1 and 10 eV electrons, namely, by reducing the electron capture cross-section of basic DNA units and the lifetime of corresponding transient anions. An interstrand electron transfer mechanism is proposed to explain the low ratios for the yields of SSB to those of DSB produced by 10 eV electrons.

  12. Influence of organic ions on DNA damage induced by 1 eV to 60 keV electrons

    NASA Astrophysics Data System (ADS)

    Zheng, Yi; Sanche, Léon

    2010-10-01

    We report the results of a study on the influence of organic salts on the induction of single strand breaks (SSBs) and double strand breaks (DSBs) in DNA by electrons of 1 eV to 60 keV. Plasmid DNA films are prepared with two different concentrations of organic salts, by varying the amount of the TE buffer (Tris-HCl and EDTA) in the films with ratio of 1:1 and 6:1 Tris ions to DNA nucleotide. The films are bombarded with electrons of 1, 10, 100, and 60 000 eV under vacuum. The damage to the 3197 base-pair plasmid is analyzed ex vacuo by agarose gel electrophoresis. The highest yields are reached at 100 eV and the lowest ones at 60 keV. The ratios of SSB to DSB are surprisingly low at 10 eV (˜4.3) at both salt concentrations, and comparable to the ratios measured with 100 eV electrons. At all characteristic electron energies, the yields of SSB and DSB are found to be higher for the DNA having the lowest salt concentration. However, the organic salts are more efficient at protecting DNA against the damage induced by 1 and 10 eV electrons. DNA damage and protection by organic ions are discussed in terms of mechanisms operative at each electron energy. It is suggested that these ions create additional electric fields within the groove of DNA, which modify the resonance parameter of 1 and 10 eV electrons, namely, by reducing the electron capture cross-section of basic DNA units and the lifetime of corresponding transient anions. An interstrand electron transfer mechanism is proposed to explain the low ratios for the yields of SSB to those of DSB produced by 10 eV electrons.

  13. Influence of organic ions on DNA damage induced by 1 eV to 60 keV electrons

    PubMed Central

    Zheng, Yi; Sanche, Léon

    2011-01-01

    We report the results of a study on the influence of organic salts on the induction of single strand breaks (SSBs) and double strand breaks (DSBs) in DNA by electrons of 1 eV to 60 keV. Plasmid DNA films are prepared with two different concentrations of organic salts, by varying the amount of the TE buffer (Tris-HCl and EDTA) in the films with ratio of 1:1 and 6:1 Tris ions to DNA nucleotide. The films are bombarded with electrons of 1, 10, 100, and 60 000 eV under vacuum. The damage to the 3197 base-pair plasmid is analyzed ex vacuo by agarose gel electrophoresis. The highest yields are reached at 100 eV and the lowest ones at 60 keV. The ratios of SSB to DSB are surprisingly low at 10 eV (~4.3) at both salt concentrations, and comparable to the ratios measured with 100 eV electrons. At all characteristic electron energies, the yields of SSB and DSB are found to be higher for the DNA having the lowest salt concentration. However, the organic salts are more efficient at protecting DNA against the damage induced by 1 and 10 eV electrons. DNA damage and protection by organic ions are discussed in terms of mechanisms operative at each electron energy. It is suggested that these ions create additional electric fields within the groove of DNA, which modify the resonance parameter of 1 and 10 eV electrons, namely, by reducing the electron capture cross-section of basic DNA units and the lifetime of corresponding transient anions. An interstrand electron transfer mechanism is proposed to explain the low ratios for the yields of SSB to those of DSB produced by 10 eV electrons. PMID:20969428

  14. Amorphization of Si(0 0 1) by ultra low energy (0.5-5 keV) ion implantation observed with high-resolution RBS

    NASA Astrophysics Data System (ADS)

    Kimura, K.; Agarwal, A.; Toyofuku, H.; Nakajima, K.; Gossmann, H.-J.

    1999-01-01

    The process of amorphization of Si(0 0 1) by ultra low energy (0.5 keV B + and 5 keV Si +) ion implantation is investigated using high-resolution RBS/channeling with a depth resolution better than 1 nm. In contrast to observations at higher implantation energies, amorphization by the ultra low energy ion implantation appears to proceed from the SiO 2/c-Si interface. The threshold dose for amorphization is determined to be ˜1 × 10 15 cm -2 for 0.5 keV B + and ˜1.5 × 10 14 cm -2 for 5 keV Si +. Comparison of the experimental results with TRIM simulations suggests that the SiO 2/c-Si interface behaves as a nucleation site for amorphization.

  15. Fragmentation of H2O by 1 -- 5 keV He^2+ ions: Experiment and Theory

    NASA Astrophysics Data System (ADS)

    Stolterfoht, N.; Hellhammer, R.; Sobocinski, P.; Cabrera-Trujillo, R.; Ohrn, Y.; Deumens, E.; Sabin, J.

    2006-05-01

    Fragmentation of H2O molecules induced by ^3He^2+ impact was investigated experimentally as a function of the energy in the range from 1-5 keV. Collisions at large impact parameters are found to produce fragment protons with energies centered around peaks at 6 eV and 15 eV. The H^+ fragments were detected in the angular range from 25 to 135 with respect to the incident beam direction. Absolute fragmentation cross sections dσ/dφ, differential in the emission angle are found to be anisotropic, with protons preferentially emitted at angles near 90 . In addition to the experiments, we performed quantum-mechanical calculations to understand the fragmentation mechanisms producing protons at preferred energies and angles. The theoretical results are obtained using the Electron-Nuclear Dynamics formalism (END), which solves the time-dependent Schr"odinger equation.

  16. Study of surface activation of PET by low energy (keV) Ni + and N + ion implantation

    NASA Astrophysics Data System (ADS)

    Nathawat, Rashi; Kumar, Anil; Kulshrestha, V.; Vijay, Y. K.; Kobayashi, T.; Kanjilal, D.

    2008-11-01

    Polyethyleneterephthalate (PET) has been modified by 100 keV Ni + and N + ions using metal ion from volatile compound (MIVOC) ion source to fluence ranging from 1 × 10 14 to 1 × 10 16 ions/cm 2. The increasing application of polymeric material in technological and scientific field has motivated the use of surface treatment to modify the physical and chemical properties of polymer surfaces. When a material is exposed to ionization radiation, it suffers damage leading to surface activation depending on the type. The surface morphology was observed by atomic force microscopy (AFM). That show the roughness increases with fluence in both the cases. The Ni particles as precipitation in PET were observed by cross-section transmission electron microscopy (XTEM). The optical band gap ( Eg) deduced from absorption spectra; was calculated by Tau'c relation. Raman spectroscopy shows quantitatively the chemical nature at the damage caused by the Ni + and N + bombardment. The ration of ID/ IG shows graphite-like structure is formed on the surface. A layer of hydrogenated amorphous carbon is formed on the surface, which has confirmed by XPS results also.

  17. High-energy accelerator for beams of heavy ions

    DOEpatents

    Martin, Ronald L.; Arnold, Richard C.

    1978-01-01

    An apparatus for accelerating heavy ions to high energies and directing the accelerated ions at a target comprises a source of singly ionized heavy ions of an element or compound of greater than 100 atomic mass units, means for accelerating the heavy ions, a storage ring for accumulating the accelerated heavy ions and switching means for switching the heavy ions from the storage ring to strike a target substantially simultaneously from a plurality of directions. In a particular embodiment the heavy ion that is accelerated is singly ionized hydrogen iodide. After acceleration, if the beam is of molecular ions, the ions are dissociated to leave an accelerated singly ionized atomic ion in a beam. Extraction of the beam may be accomplished by stripping all the electrons from the atomic ion to switch the beam from the storage ring by bending it in magnetic field of the storage ring.

  18. Transferring Gus gene into intact rice cells by low energy ion beam

    NASA Astrophysics Data System (ADS)

    Zengliang, Yu; Jianbo, Yang; Yuejin, Wu; Beijiu, Cheng; Jianjun, He; Yuping, Huo

    1993-06-01

    A new technique of transferring genes by low energy ion beam has been reported in this paper. The Gus and CAT (chloramphenicol acetyltransferase) genes, as "foreign" genetic materials, were introduced into the suspension cells and ripe embryos or rice by implantation of 20-30 keV Ar + at doses ranging from 1 × 10 15 to 4 × 10 15 ions/cm 2. The activities of CAT and Gus were detected in the cells and embryos after several weeks. The results indicate that the transfer was a success.

  19. Persistent ion beam induced conductivity in zinc oxide nanowires

    SciTech Connect

    Johannes, Andreas; Niepelt, Raphael; Gnauck, Martin; Ronning, Carsten

    2011-12-19

    We report persistently increased conduction in ZnO nanowires irradiated by ion beam with various ion energies and species. This effect is shown to be related to the already known persistent photo conduction in ZnO and dubbed persistent ion beam induced conduction. Both effects show similar excitation efficiency, decay rates, and chemical sensitivity. Persistent ion beam induced conduction will potentially allow countable (i.e., single dopant) implantation in ZnO nanostructures and other materials showing persistent photo conduction.

  20. Persistent ion beam induced conductivity in zinc oxide nanowires

    NASA Astrophysics Data System (ADS)

    Johannes, Andreas; Niepelt, Raphael; Gnauck, Martin; Ronning, Carsten

    2011-12-01

    We report persistently increased conduction in ZnO nanowires irradiated by ion beam with various ion energies and species. This effect is shown to be related to the already known persistent photo conduction in ZnO and dubbed persistent ion beam induced conduction. Both effects show similar excitation efficiency, decay rates, and chemical sensitivity. Persistent ion beam induced conduction will potentially allow countable (i.e., single dopant) implantation in ZnO nanostructures and other materials showing persistent photo conduction.

  1. Ion beam mixing of metal/fluoropolymer interfaces

    SciTech Connect

    Dennis, D. L.; Giedd, R. E.; Wang, Y. Q.; Glass, G. A.

    1999-06-10

    Ion beam mixing of metals and polymers with very low dielectric constants such as Teflon can provide many applications in the area of electronic materials. This work is a study of the 'mixing' effect of 50 keV nitrogen implanted thin metal layers on Teflon PTFE (polytetrafluoroethylene) substrates. RBS analysis shows that the distribution of thin layers of copper and chromium (approximately 300-400 A thick) through the implant layer of the Teflon depends on the reactivity of the metal. As the implant fluence is increased, the distribution of metal atoms in the polymer matrix becomes concentrated over smaller ranges near the bottom of the implant layer. In situ RGA analysis during the implantation shows the liberation of an abundance of fluorine in many different forms. This is supported by results from a NRA experiment that shows the non-uniform concentration profile of fluorine throughout the implant layer. During the implantation process, the fluorine is released through the incident ion track leaving a carbon and metal rich region near the surface of the implant layer. The fluorine density increases with depth through the implant layer making a smooth transition to the undamaged bulk Teflon below. Low dielectric materials with highly conductive surfaces, such as this one, may provide an opportunity for a broad range of new microelectronic applications.

  2. Ion beam mixing of metal/fluoropolymer interfaces

    SciTech Connect

    Dennis, D.L.; Giedd, R.E.; Wang, Y.Q.; Glass, G.A.

    1999-06-01

    Ion beam mixing of metals and polymers with very low dielectric constants such as Teflon can provide many applications in the area of electronic materials. This work is a study of the {open_quotes}mixing{close_quotes} effect of 50 keV nitrogen implanted thin metal layers on Teflon PTFE (polytetrafluoroethylene) substrates. RBS analysis shows that the distribution of thin layers of copper and chromium (approximately 300-400 {Angstrom} thick) through the implant layer of the Teflon depends on the reactivity of the metal. As the implant fluence is increased, the distribution of metal atoms in the polymer matrix becomes concentrated over smaller ranges near the bottom of the implant layer. {ital In situ} RGA analysis during the implantation shows the liberation of an abundance of fluorine in many different forms. This is supported by results from a NRA experiment that shows the non-uniform concentration profile of fluorine throughout the implant layer. During the implantation process, the fluorine is released through the incident ion track leaving a carbon and metal rich region near the surface of the implant layer. The fluorine density increases with depth through the implant layer making a smooth transition to the undamaged bulk Teflon below. Low dielectric materials with highly conductive surfaces, such as this one, may provide an opportunity for a broad range of new microelectronic applications. {copyright} {ital 1999 American Institute of Physics.}

  3. Ion beam mixing of metal/fluoropolymer interfaces

    NASA Astrophysics Data System (ADS)

    Dennis, D. L.; Giedd, R. E.; Wang, Y. Q.; Glass, G. A.

    1999-06-01

    Ion beam mixing of metals and polymers with very low dielectric constants such as Teflon can provide many applications in the area of electronic materials. This work is a study of the "mixing" effect of 50 keV nitrogen implanted thin metal layers on Teflon PTFE (polytetrafluoroethylene) substrates. RBS analysis shows that the distribution of thin layers of copper and chromium (approximately 300-400 Å thick) through the implant layer of the Teflon depends on the reactivity of the metal. As the implant fluence is increased, the distribution of metal atoms in the polymer matrix becomes concentrated over smaller ranges near the bottom of the implant layer. In situ RGA analysis during the implantation shows the liberation of an abundance of fluorine in many different forms. This is supported by results from a NRA experiment that shows the non-uniform concentration profile of fluorine throughout the implant layer. During the implantation process, the fluorine is released through the incident ion track leaving a carbon and metal rich region near the surface of the implant layer. The fluorine density increases with depth through the implant layer making a smooth transition to the undamaged bulk Teflon below. Low dielectric materials with highly conductive surfaces, such as this one, may provide an opportunity for a broad range of new microelectronic applications.

  4. Electron beam diagnostic for space charge measurement of an ion beam

    SciTech Connect

    Roy, Prabir K.; Yu, Simon S.; Henestroza, Enrique; Eylon, Shmuel; Shuman, Derek B.; Ludvig, Jozsef; Bieniosek, Frank M.; Waldron, William L.; Greenway, Wayne G.; Vanecek, David L.; Hannink, Ryan; Amezcua, Monserrat

    2004-09-25

    A non-perturbing electron beam diagnostic system for measuring the charge distribution of an ion beam is developed for Heavy Ion Fusion (HIF) beam physics studies. Conventional diagnostics require temporary insertion of sensors into the beam, but such diagnostics stop the beam, or significantly alter its properties. In this diagnostic a low energy, low current electron beam is swept transversely across the ion beam; the measured electron beam deflection is used to infer the charge density profile of the ion beam. The initial application of this diagnostic is to the Neutralized Transport Experiment (NTX), which is exploring the physics of space-charge-dominated beam focusing onto a small spot using a neutralizing plasma. Design and development of this diagnostic and performance with the NTX ion beamline is presented.

  5. Studies on space charge neutralization and emittance measurement of beam from microwave ion source

    SciTech Connect

    Misra, Anuraag; Goswami, A.; Sing Babu, P.; Srivastava, S.; Pandit, V. S. E-mail: vspandit12@gmail.com

    2015-11-15

    A 2.45 GHz microwave ion source together with a beam transport system has been developed at VECC to study the problems related with the injection of high current beam into a compact cyclotron. This paper presents the results of beam profile measurement of high current proton beam at different degrees of space charge neutralisation with the introduction of neon gas in the beam line using a fine leak valve. The beam profiles have been measured at different pressures in the beam line by capturing the residual gas fluorescence using a CCD camera. It has been found that with space charge compensation at the present current level (∼5 mA at 75 keV), it is possible to reduce the beam spot size by ∼34%. We have measured the variation of beam profile as a function of the current in the solenoid magnet under the neutralised condition and used these data to estimate the rms emittance of the beam. Simulations performed using equivalent Kapchinsky-Vladimirsky beam envelope equations with space charge neutralization factor are also presented to interpret the experimental results.

  6. Morphological change of self-organized protrusions of fluoropolymer surface by ion beam irradiation

    NASA Astrophysics Data System (ADS)

    Kitamura (Ogawa), Akane; Kobayashi, Tomohiro; Satoh, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Suzuki, Akihiro; Terai, Takayuki

    2013-07-01

    Polytetrafluoroethylene (PTFE) and fluorinated ethylene propylene (FEP) are typical fluoropolymers displaying several desirable technological properties such as electrical insulation and high chemical resistance. When their surfaces are irradiated with ion beams, dense micro-protrusions formed after the emergence and spread of micropores across the entire irradiated area, allowing culture cells to spread on the top of the protrusions. In this study, we investigate the morphological changes introduced in the fluoropolymer surfaces by ion beams as the energy of the beams is increased. When an FEP sample was irradiated with a nitrogen ion beam with an energy of less than 350 keV at 1.0 μA/cm2, protrusions were formed with a density between 2 × 107/cm2 and 2 × 108/cm2. However, at energies higher than 350 keV, the protrusions became sparse, and the density dropped to 5 × 102/cm2. Protrusions appeared sporadically during irradiation at high energies, and the top of the protrusions appeared as spots inside the sample, which were difficult to etch and became elongated as the erosion of the surface progressed. Erosion was caused by sputtering of FEP molecules and evaporation at notably elevated temperatures on the surface. Analysis based on attenuated total reflectance/Fourier transform infrared spectroscopy showed the presence of Cdbnd C bonds as well as -COOH, -Cdbnd O, and -OH bonds on all irradiated samples. Their concentration on the surface densely covered with micro-protrusions was higher than that on the surface with sparse protrusions after irradiation at energies exceeding 350 keV. Thus, we determined a suitable range for the ion energy for creating FEP surfaces densely covered with protrusions.

  7. Prototype detectors for measuring poloidal magnetic flux with an ion beam probe

    NASA Astrophysics Data System (ADS)

    Crowley, T. P.; Demers, D. R.; Fimognari, P. J.; Kile, T. D.

    2016-10-01

    Development of a detector and associated techniques to determine the localized magnetic flux, and therefore poloidal magnetic field and current density profile, in an axisymmetric plasma device is underway. This will provide invaluable information on equilibrium, transport and stability studies of fusion plasmas. A singly charged ion beam is injected into the plasma and the detector located outside the plasma measures doubly charged ions created within a cm-scale sample volume of the plasma. The ions are split into beamlets at the detector. The toroidal angle of the beam's velocity is determined by measuring the fraction of the beamlets that strike detection plates and wires. The corresponding angle is used to determine the beam's toroidal velocity component. Due to canonical momentum conservation, that toroidal velocity is proportional to the poloidal flux function in the sample volume. We have built several prototype detectors and measured the angle of a 45 keV potassium ion beam. The cross-section of the plasma that can be studied will be maximized and system costs will be minimized if the detector has a direct view of the plasma and is operated close to it. However, this subjects the detector to noise due to UV-induced photoelectrons and plasma particles. We have conducted experiments that demonstrate reductions of this noise to facilitate measurement of ion beam signals. Experimental and design results will be presented. This work is supported by US DoE Award No. DE-SC0006077.

  8. Ion beam mixing effects in Ag precipitates embedded in MgO crystals

    NASA Astrophysics Data System (ADS)

    Fuchs, G.; Abouchacra, G.; Treilleux, M.; Thevenard, P.; Serughetti, J.

    1988-05-01

    MgO single crystals have been implanted at room temperature with 8 × 10 16 Ag cm -2 of 180 keV energy. After 973 K thermal annealing, Ag atoms precipitate in the MgO matrix. The MgOAg samples were then irradiated at 77 K with 800 keV xenon up to 1.7 × 10 16 ions cm -2. The modification of the metallic precipitated phase induced by such ionic bombardment, has been characterized by optical absorption spectroscopy (OAS) and transmission electron microscopy (TEM). The evolution of the optical spectra with xenon bombardment has been interpreted in terms of silver precipitate dispersion induced by ion beam mixing effects. The inhibition of atomic diffusion or radiation induced diffusion, due the low sample temperature during irradiation, increases the efficiency of atomic mixing effects. TEM observations confirm this assumption.

  9. Synthesis, structure and properties of superhard nanostructured films deposited by the C60 ion beam.

    PubMed

    Pukha, V E; Pugachov, A T; Churakova, N P; Zubarev, E N; Vinogradov, V E; Nam, S C

    2012-06-01

    In this work, we present results on study of DLC, nanocomposite and nanocrystal nanographite films synthesized utilizing mass-separated beam of C60-ions with energy in range from 2 to 6 keV (energy dispersions approximately 1 keV) and at Ts in the range of RT - 873 K. The dependence of the structure, mechanical and electrical properties from the ion energy and substrate temperature was revealed. We demonstrate a possibility to control the orientation of the base planes in the nanographite grains during the film growth. The dependence of mechanical properties of the films from the orientation of the base planes was defined. It is discussed a mechanisms of oriented growth for nanocrystal graphite. Possible applications of the textured nanocomposite and nanographite films are nanodevices, thin-filmed lithium batteries and field-emitter arrays.

  10. Ion Beam Collimation For Improved Resolution In Associated Particle Imaging

    NASA Astrophysics Data System (ADS)

    Sy, Amy; Ji, Qing

    2011-06-01

    Beam spot size on target for a Penning ion source has been measured under different source operating pressures as a function of the extraction channel length and beam energy. A beam halo/core structure was observed for ion extraction at low extraction voltages, and was greatly reduced at higher beam energy. Collimation through use of longer extraction channels results in reduced ion current on target; the resultant reduction in neutron yield for an API system driven by such an ion source can be compensated for by use of even higher beam energies.

  11. Relevance of surface viscous flow, surface diffusion, and ballistic effects in keV ion smoothing of amorphous surfaces

    SciTech Connect

    Vauth, Sebastian; Mayr, S. G.

    2007-06-01

    Surface viscous flow, surface diffusion, and ballistic effects have recently been discussed as possible atomic-scale mechanisms to explain the dramatic smoothing reactions observed during keV ion bombardment of amorphous surfaces. By employing multiscale modeling, viz. a combination of molecular dynamics and continuum rate equations, we compare the relevance of the individual processes at room temperature. This is achieved by calculating diffusion constants, viscosities, and lateral transport due to momentum transfer. Depending on the surface structure size, we find the dominance of surface viscous flow or ballistic effects. The findings are found to be valid for both strong and fragile glasses, as represented by amorphous Si and CuTi, respectively.

  12. Stopping power of 100-600 keV F +, Ar +, As +, Br + and Xe + ions in silicon

    NASA Astrophysics Data System (ADS)

    Chun-yu, Tan; Yue-yuan, Xia; Hong, Yang; Xiu-fang, Sun; Jia-rui, Liu; Zong-shuang, Zheng; Pei-ran, Zhu

    1988-06-01

    The stopping power of 100-600 keV F +, Ar +, As +, Br + and Xe + ions in silicon have been obtained from measured range distribution obtained by NRA and RBS techniques. A deconvolution program was used in order to obtain true range distributions from the measured NRA excitation curves or RBS spectra. The total stopping powers were determined through fitting the projected ranges based on LSS transport theory to the experimentally determined projected ranges. After subtracting calculated nuclear stopping cross sections, the electronic stopping cross sections were obtained. These results indicate that the electronic stopping cross sections at low velocities may be described by the four-parameter formulae proposed previously and that deviation from the velocity-proportional electronic stopping is evident.

  13. The electrical properties of 60 keV zinc ions implanted into semi-insulating gallium arsenide

    NASA Technical Reports Server (NTRS)

    Littlejohn, M. A.; Anikara, R.

    1972-01-01

    The electrical behavior of zinc ions implanted into chromium-doped semiinsulating gallium arsenide was investigated by measurements of the sheet resistivity and Hall effect. Room temperature implantations were performed using fluence values from 10 to the 12th to 10 to the 15th power/sq cm at 60 keV. The samples were annealed for 30 minutes in a nitrogen atmosphere up to 800 C in steps of 200 C and the effect of this annealing on the Hall effect and sheet resistivity was studied at room temperature using the Van der Pauw technique. The temperature dependence of sheet resistivity and mobility was measured from liquid nitrogen temperature to room temperature. Finally, a measurement of the implanted profile was obtained using a layer removal technique combined with the Hall effect and sheet resistivity measurements.

  14. Long pulse acceleration of MeV class high power density negative H{sup −} ion beam for ITER

    SciTech Connect

    Umeda, N. Kojima, A.; Kashiwagi, M.; Tobari, H.; Hiratsuka, J.; Watanabe, K.; Dairaku, M.; Yamanaka, H.; Hanada, M.

    2015-04-08

    R and D of high power density negative ion beam acceleration has been carried out at MeV test facility in JAEA to realize ITER neutral beam accelerator. The main target is H{sup −} ion beam acceleration up to 1 MeV with 200 A/m{sup 2} for 60 s whose pulse length is the present facility limit. For long pulse acceleration at high power density, new extraction grid (EXG) has been developed with high cooling capability, which electron suppression magnet is placed under cooling channel similar to ITER. In addition, aperture size of electron suppression grid (ESG) is enlarged from 14 mm to 16 mm to reduce direct interception on the ESG and emission of secondary electron which leads to high heat load on the upstream acceleration grid. By enlarging ESG aperture, beam current increased 10 % at high current beam and total acceleration grid heat load reduced from 13 % to 10 % of input power at long pulse beam. In addition, heat load by back stream positive ion into the EXG is measured for the first time and is estimated as 0.3 % of beam power, while heat load by back stream ion into the source chamber is estimated as 3.5 ~ 4.0 % of beam power. Beam acceleration up to 60 s which is the facility limit, has achieved at 683 keV, 100 A/m{sup 2} of negative ion beam, whose energy density increases two orders of magnitude since 2011.

  15. The Neutralization of Ion-Rocket Beams

    NASA Technical Reports Server (NTRS)

    Kaufman, Harold R.

    1961-01-01

    The experimental ion-beam behavior obtained without neutralizers is compared with both simple collision theory and plasma-wave theory. This comparison indicates that plasma waves play an important part in beam behavior, although the present state of plasma-wave theory does not permit more than a qualitative comparison. The theories of immersed-emitter and electron-trap neutralizer operation are discussed; and, to the extent permitted by experimental data, the theory is compared with experimental results. Experimental data are lacking completely at the present time for operation in space. The results that might be expected in space and the means of simulating such operation in Earth-bound facilities, however, are discussed.

  16. A negative ion beam application to artificial formation of neuron network in culture

    NASA Astrophysics Data System (ADS)

    Tsuji, Hiroshi; Sato, Hiroko; Baba, Takahiro; Gotoh, Yasuhito; Ishikawa, Junzo

    2000-02-01

    A negative ion beam modification of the biocompatibility of polystyrene surface was investigated for the artificial formation of neuron network in culture with respect to negative ion species. Negative ions of silver, copper or carbon were implanted in nontreated polystyrene (NTPS) dishes at conditions of 20 keV and 3×1015ions/cm2 through a mask with many slits of 60 μm in width. For the surface wettability, the contact angle of ion-implanted NTPS was about 75° for silver-negative ions, which was lower than 86° of the original NTPS. For carbon implantation, on the contrary, the contact angles did not change from the original value. In culture experiment using neuron cells of PC-12h (rat adrenal pheochromocytoma), the cells cultured with serum medium in two days showed the cell attachment and growth in number only at the ion-implanted region on NTPS for all ion species. In another two days in culture with nonserum medium including a nerve growth factor, the outgrowth of neural protrusions was also observed only at the ion-implanted region for all ion species. There was a difference in number of attached cells for ion species. The silver-negative ion-implanted NTPS had a large effect for cell attachment compared with other two ion species. This reason is considered to be due to the lowest contract angles among them.

  17. Impact-parameter dependence of energy loss for 625-keV H[sup +] ions in Si single crystals

    SciTech Connect

    Dygo, A.; Boshart, M.A.; Seiberling, L.E. ); Kabachnik, N.M. )

    1994-12-01

    The energy distributions for 625-keV H[sup +] ions transmitted through thin Si single crystals are studied for detailed angular scans through the [l angle]110[r angle] and [l angle]100[r angle] axial as well as the [l brace]111[r brace] and [l brace]110[r brace] planar channels. Well-resolved structures in the distributions taken near the [l angle]110[r angle] axial direction are observed. The experimental energy-loss distributions are very well reproduced by a Monte Carlo simulation using the semiclassical approximation model for core electrons and the two-component free-electron-gas model for valence electrons. The best fit to the data is obtained if the model energy losses are scaled up for core electrons and down for valence electrons by several percent. The experimental distributions can also be reproduced by assuming the mean excitation energy for distant collisions of the ion with core electrons equal to 1.4 times the binding energy for a given shell. No significant differences between the distributions obtained using the solid-state and free-atom valence electron densities have been found. The evolution of the distributions for the [l angle]110[r angle] axial scan is discussed in terms of ion trajectories and the flux distribution. Also, the azimuthally averaged mean energy loss is studied as a function of tilt angle with respect to the [l angle]110[r angle] axis.

  18. The ReA electron-beam ion trap charge breeder for reacceleration of rare isotopes

    SciTech Connect

    Lapierre, A.; Schwarz, S.; Kittimanapun, K.; Fogleman, J.; Krause, S.; Nash, S.; Rencsok, R.; Tobos, L.; Perdikakis, G.; Portillo, M.; Rodriguez, J. A.; Wittmer, W.; Wu, X.; Bollen, G.; Leitner, D.; Syphers, M.; Collaboration: ReA Team

    2013-04-19

    ReA is a post-accelerator at the National Superconducting Cyclotron Laboratory at Michigan State University. ReA is designed to reaccelerate rare isotopes to energies of a few MeV/u following production by projectile fragmentation and thermalization in a gas cell. The facility consists of four main components: an electron-beam ion trap (EBIT) charge breeder, an achromatic charge-over-mass (Q/A) separator, a radio-frequency quadrupole accelerator, and a superconducting radio-frequency linear accelerator. The EBIT charge breeder was specifically designed to efficiently capture continuous beams of singly charged ions injected at low energy (<60 keV), charge breed in less than 50 ms, and extract highly charged ions to the Q/A separator for charge-state selection and reacceleration through the accelerator structures. The use of highly charged ions to reach high beam energies is a key aspect that makes ReA a compact and cost-efficient post-accelerator. The EBIT is characterized by a high-current electron gun, a long multi-electrode trap structure and a dual magnet to provide both the high electron-beam current density necessary for fast charge breeding of short-lived isotopes as well as the high capture probability of injected beams. This paper presents an overview and the status of the ReA EBIT, which has extracted for reacceleration tests stable {sup 20}Ne{sup 8+} ion beams produced from injected gas and more recently {sup 39}K{sup 16+} beams by injecting stable {sup 39,41}K{sup +} ions from an external ion source.

  19. The ReA electron-beam ion trap charge breeder for reacceleration of rare isotopes

    NASA Astrophysics Data System (ADS)

    Lapierre, A.; Schwarz, S.; Kittimanapun, K.; Fogleman, J.; Krause, S.; Nash, S.; Rencsok, R.; Tobos, L.; Perdikakis, G.; Portillo, M.; Rodriguez, J. A.; Wittmer, W.; Wu, X.; Bollen, G.; Leitner, D.; Syphers, M.; ReA Team

    2013-04-01

    ReA is a post-accelerator at the National Superconducting Cyclotron Laboratory at Michigan State University. ReA is designed to reaccelerate rare isotopes to energies of a few MeV/u following production by projectile fragmentation and thermalization in a gas cell. The facility consists of four main components: an electron-beam ion trap (EBIT) charge breeder, an achromatic charge-over-mass (Q/A) separator, a radio-frequency quadrupole accelerator, and a superconducting radio-frequency linear accelerator. The EBIT charge breeder was specifically designed to efficiently capture continuous beams of singly charged ions injected at low energy (<60 keV), charge breed in less than 50 ms, and extract highly charged ions to the Q/A separator for charge-state selection and reacceleration through the accelerator structures. The use of highly charged ions to reach high beam energies is a key aspect that makes ReA a compact and cost-efficient post-accelerator. The EBIT is characterized by a high-current electron gun, a long multi-electrode trap structure and a dual magnet to provide both the high electron-beam current density necessary for fast charge breeding of short-lived isotopes as well as the high capture probability of injected beams. This paper presents an overview and the status of the ReA EBIT, which has extracted for reacceleration tests stable 20Ne8+ ion beams produced from injected gas and more recently 39K16+ beams by injecting stable 39,41K+ ions from an external ion source.

  20. Low temperature Ti-Si-C thin film deposition by ion beam assisted methods

    NASA Astrophysics Data System (ADS)

    Twardowska, Agnieszka; Rajchel, Boguslaw; Jaworska, Lucyna

    2010-11-01

    Thin, multiphase Ti-Si-C coatings were formed by IBSD or by IBAD methods on AISI 316L steel substrates in room temperature, using single Ti3SiC2 target. In those methods the TiXSiCY coatings were formed from the flux of energetic atoms and ions obtained by ion sputtering of the Ti3SiC2 compound sample. As sputtering beam the beam of Ar+ ions at energy of 15keV was applied. In the IBAD method the dynamically formed coatings were additionally bombarded by beam of Ar+ ions at energy of 15keV. The ion beams parameters were obtained by using Monte Carlo computer simulations. The morphology (SEM, TEM), chemical (EDS/EDX) and phase composition (XRD) examinations of formed coatings were provided as well as confocal Raman microspectroscopy. Analyzed coatings were relatively thin (150nm-1μm), flat and dense. XRD analysis indicated in amorphous TiSi, the traces of Ti5Si3 and other phases from Ti-Si-C system (TiSi, TiSi2,Ti3SiC2). For chemical bonds investigation, the laser beam with length of 532nm was used. Those analyses were performed in the low (LR) or in high (HR) resolution modes in room temperature and in 4000C. In the HR mode the spectral resolution was close to 2 cm-1. In Raman spectra peaks at: 152cm-1, 216cm-1, 278cm-1, 311 cm-1, 608cm-1, 691cm-1 were recorded. Nanoindentation tests were done on coated and uncoated substrates with diamond, Berkovich-type indenter. Vickers hardness HIT and reduced elastic modulus EIT were calculated using Olivier& Pharr method. HIT for coated substrates was in the range 2.7 to 5.3 GPa, EIT was 160 GPa.

  1. Intense ion beam optimization and characterization with thermal imaging

    SciTech Connect

    Davis, H.A.; Bartsch, R.R.; Rej, D.J.; Waganaar, W.J.

    1994-08-01

    The authors have developed thermal imaging of beam targets to optimize and characterize intense ion beams. The technique, which measures the beam energy-density distribution on each machine firing, has been used to rapidly develop and characterize two very different beams--a 400 kV beam used to study materials processing, and an 80 kV beam use for magnetic fusion diagnostics.

  2. Plasma and ion beam processing at Los Alamos

    SciTech Connect

    Rej, D.J.; Davis, H.A.; Henins, I.

    1994-07-01

    Efforts are underway at Los Alamos National Laboratory to utilize plasma and intense ion beam science and technology of the processing of advanced materials. A major theme involves surface modification of materials, e.g., etching, deposition, alloying, and implantation. In this paper, we concentrate on two programs, plasma source ion implantation and high-intensity pulsed ion beam deposition.

  3. Development of a focused ion beam micromachining system

    SciTech Connect

    Pellerin, J.G.; Griffis, D.; Russell, P.E.

    1988-12-01

    Focused ion beams are currently being investigated for many submicron fabrication and analytical purposes. An FIB micromachining system consisting of a UHV vacuum system, a liquid metal ion gun, and a control and data acquisition computer has been constructed. This system is being used to develop nanofabrication and nanomachining techniques involving focused ion beams and scanning tunneling microscopes.

  4. Edge envelope equation for a ballistically focused neutralized ion beam

    SciTech Connect

    Lemons, D.S.; Thode, L.E.

    1980-11-01

    An envelope equation for a cold ion beam with overall charge and current neutralization provided by a coflowing electron gas obeying an adiabatic equation of state is derived. The derivation assumes the beam evolves self-similarly with the ion at the edge of a uniform density ion profile. Numerical and approximate analytical solutions are calculated.

  5. Making radioactive ion beams - Detecting reaction products

    NASA Astrophysics Data System (ADS)

    Raabe, Riccardo

    2016-10-01

    We present a didactical overview of the methods for the production of radioactive ion beams (RIBs), discussing the main characteristics and associated advantages and drawbacks of the in-flight separation and isotope separation on-line methods. We include a short overview of present and planned facilities, focusing on Europe. In the second part of the paper a brief introduction on the detection of radiation is given, followed by a discussion of the specific problems related to radiation detection in measurements involving RIBs. A few illustrative examples of detection setups are presented.

  6. Ion beams provided by small accelerators for material synthesis and characterization

    NASA Astrophysics Data System (ADS)

    Mackova, Anna; Havranek, Vladimir

    2017-06-01

    The compact, multipurpose electrostatic tandem accelerators are extensively used for production of ion beams with energies in the range from 400 keV to 24 MeV of almost all elements of the periodic system for the trace element analysis by means of nuclear analytical methods. The ion beams produced by small accelerators have a broad application, mainly for material characterization (Rutherford Back-Scattering spectrometry, Particle Induced X ray Emission analysis, Nuclear Reaction Analysis and Ion-Microprobe with 1 μm lateral resolution among others) and for high-energy implantation. Material research belongs to traditionally progressive fields of technology. Due to the continuous miniaturization, the underlying structures are far beyond the analytical limits of the most conventional methods. Ion Beam Analysis (IBA) techniques provide this possibility as they use probes of similar or much smaller dimensions (particles, radiation). Ion beams can be used for the synthesis of new progressive functional nanomaterials for optics, electronics and other applications. Ion beams are extensively used in studies of the fundamental energetic ion interaction with matter as well as in the novel nanostructure synthesis using ion beam irradiation in various amorphous and crystalline materials in order to get structures with extraordinary functional properties. IBA methods serve for investigation of materials coming from material research, industry, micro- and nano-technology, electronics, optics and laser technology, chemical, biological and environmental investigation in general. Main research directions in laboratories employing small accelerators are also the preparation and characterization of micro- and nano-structured materials which are of interest for basic and oriented research in material science, and various studies of biological, geological, environmental and cultural heritage artefacts are provided too.

  7. Ion beam surface treatment: A new technique for thermally modifying surfaces using intense, pulsed ion beams

    SciTech Connect

    Stinnett, R.W.; Buchheit, R.G.; Neau, E.L.

    1995-08-01

    The emerging capability to produce high average power (10--300 kW) pulsed ion beams at 0.2{minus}2 MeV energies is enabling us to develop a new, commercial-scale thermal surface treatment technology called Ion Beam Surface Treatment (IBEST). This new technique uses high energy, pulsed ({le}500 ns) ion beams to directly deposit energy in the top 1--20 micrometers of the surface of any material. The depth of treatment is controllable by varying the ion energy and species. Deposition of the energy in a thin surface layer allows melft of the layer with relatively small energies (1--10J/cm2) and allows rapid cooling of the melted layer by thermal conduction into the underlying substrate. Typical cooling rates of this process (109 K/sec) are sufficient to cause amorphous layer formation and the production of non-equilibrium microstructures (nanocrystalline and metastable phases). Results from initial experiments confirm surface hardening, amorphous layer and nanocrystalline grain size formation, corrosion resistance in stainless steel and aluminum, metal surface polishing, controlled melt of ceramic surfaces, and surface cleaning and oxide layer removal as well as surface ablation and redeposition. These results follow other encouraging results obtained previously in Russia using single pulse ion beam systems. Potential commercialization of this surface treatment capability is made possible by the combination of two new technologies, a new repetitive high energy pulsed power capability (0.2{minus}2MV, 25--50 kA, 60 ns, 120 Hz) developed at SNL, and a new repetitive ion beam system developed at Cornell University.

  8. Ion-beam-produced damage and its stability in AlN films

    NASA Astrophysics Data System (ADS)

    Kucheyev, S. O.; Williams, J. S.; Zou, J.; Jagadish, C.; Pophristic, M.; Guo, S.; Ferguson, I. T.; Manasreh, M. O.

    2002-10-01

    Structural characteristics of single-crystal wurtzite AlN epilayers (grown on sapphire substrates) bombarded with 300 keV 197Au+ ions at room and liquid-nitrogen temperatures (RT and LN2) are studied by a combination of Rutherford backscattering/channeling spectrometry and cross-sectional transmission electron microscopy. Results reveal extremely strong dynamic annealing of ion-beam-generated defects in AlN. Lattice amorphization is not observed even for very large doses of keV heavy ions at LN2. An increase in irradiation temperature from LN2 to RT has a relatively small effect on the production of stable structural damage in AlN. In contrast to the case of AlxGa1-xN with x⩽0.6, neither damage saturation in the crystal bulk (below the random level) nor preferential surface disordering is revealed for AlN. Results also show that structural lattice disorder produced in AlN by high-dose keV heavy-ion bombardment is stable to rapid thermal annealing at temperatures as high as 1000 °C.

  9. Ion beam irradiated optical channel waveguides

    NASA Astrophysics Data System (ADS)

    Bányász, I.; Rajta, I.; Nagy, G. U. L.; Zolnai, Z.; Havranek, V.; Pelli, S.; Veres, M.; Himics, L.; Berneschi, S.; Nunzi-Conti, G.; Righini, G. C.

    2014-03-01

    Nowadays, in the modern optical communications systems, channel waveguides represent the core of many active and passive integrated devices, such as amplifiers, lasers, couplers and splitters. Different materials and fabrication processes were investigated in order to achieve the aforementioned optoelectronic circuits with low costs and high performance and reproducibility. Nevertheless, the 2D guiding structures fabrication continues to be a challenging task in some of optical materials due to their susceptibility to mechanical and/or chemical damages which can occur during the different steps of the fabrication process. Here we report on channel waveguides demonstration in erbium doped Tungsten - Tellurite (Er3+:TeO2-WO3) glasses and BGO crystals by means of a masked ion beam and/or direct writing processes performed at different energy MeV and ions species. The evidence of the waveguides formation was investigated by microscopy techniques and micro Raman spectroscopy.

  10. Comparative Dosimetric Estimates of a 25 keV Electron Micro-beam with three Monte Carlo Codes

    SciTech Connect

    Mainardi, Enrico; Donahue, Richard J.; Blakely, Eleanor A.

    2002-09-11

    The calculations presented compare the different performances of the three Monte Carlo codes PENELOPE-1999, MCNP-4C and PITS, for the evaluation of Dose profiles from a 25 keV electron micro-beam traversing individual cells. The overall model of a cell is a water cylinder equivalent for the three codes but with a different internal scoring geometry: hollow cylinders for PENELOPE and MCNP, whereas spheres are used for the PITS code. A cylindrical cell geometry with scoring volumes with the shape of hollow cylinders was initially selected for PENELOPE and MCNP because of its superior simulation of the actual shape and dimensions of a cell and for its improved computer-time efficiency if compared to spherical internal volumes. Some of the transfer points and energy transfer that constitute a radiation track may actually fall in the space between spheres, that would be outside the spherical scoring volume. This internal geometry, along with the PENELOPE algorithm, drastically reduced the computer time when using this code if comparing with event-by-event Monte Carlo codes like PITS. This preliminary work has been important to address dosimetric estimates at low electron energies. It demonstrates that codes like PENELOPE can be used for Dose evaluation, even with such small geometries and energies involved, which are far below the normal use for which the code was created. Further work (initiated in Summer 2002) is still needed however, to create a user-code for PENELOPE that allows uniform comparison of exact cell geometries, integral volumes and also microdosimetric scoring quantities, a field where track-structure codes like PITS, written for this purpose, are believed to be superior.

  11. Positive and negative ion beam merging system for neutral beam production

    DOEpatents

    Leung, Ka-Ngo; Reijonen, Jani

    2005-12-13

    The positive and negative ion beam merging system extracts positive and negative ions of the same species and of the same energy from two separate ion sources. The positive and negative ions from both sources pass through a bending magnetic field region between the pole faces of an electromagnet. Since the positive and negative ions come from mirror image positions on opposite sides of a beam axis, and the positive and negative ions are identical, the trajectories will be symmetrical and the positive and negative ion beams will merge into a single neutral beam as they leave the pole face of the electromagnet. The ion sources are preferably multicusp plasma ion sources. The ion sources may include a multi-aperture extraction system for increasing ion current from the sources.

  12. Evaluation of surface damage on organic materials irradiated with Ar cluster ion beam

    SciTech Connect

    Yamamoto, Y.; Ichiki, K.; Ninomiya, S.; Matsuo, J.; Seki, T.; Aoki, T.

    2011-01-07

    The sputtering yields of organic materials under large cluster ion bombardment are much higher than those under conventional monomer ion bombardment. The sputtering rate of arginine remains constant with fluence for an Ar cluster ion beam, but decreases with fluence for Ar monomer. Additionally, because Ar cluster etching induces little damage, Ar cluster ion can be used to achieve molecular depth profiling of organic materials. In this study, we evaluated the damage to poly methyl methacrylate (PMMA) and arginine samples irradiated with Ar atomic and Ar cluster ion beams. Arginine samples were analyzed by secondary ion mass spectrometry (SIMS) and PMMA samples were analyzed by X-ray photoelectron spectroscopy (XPS). The chemical structure of organic materials remained unchanged after Ar cluster irradiation, but was seriously damaged. These results indicated that bombardment with Ar cluster ions induced less surface damage than bombardment with Ar atomic ion. The damage layer thickness with 5 keV Ar cluster ion bombardment was less than 1 nm.

  13. Progress and future developments of high current ion source for neutral beam injector in the ASIPP

    NASA Astrophysics Data System (ADS)

    Hu, Chundong; Xie, Yahong; Xie, Yuanlai; Liu, Sheng; Liu, Zhimin; Xu, Yongjian; Liang, Lizhen; Sheng, Peng; Jiang, Caichao

    2015-04-01

    A high current hot cathode bucket ion source, which based on the US long pulse ion source is developed in Institute of Plasma Physics, Chinese Academy of Sciences. The ion source consists of a bucket plasma generator with multi-pole cusp fields and a set of tetrode accelerator with slit apertures. So far, four ion sources are developed and conditioned on the ion source test bed. 4 MW hydrogen beam with beam energy of 80 keV is extracted. In Aug. 2013, EAST NBI 1 with two ion source installed on the EAST, and achieved H-mode plasma with NBI injection for the first time. In order to achieve stable long pulse operation of high current ion source and negative ion source research, the RF ion source with 200 mm diameter and 120 mm depth driver is designed and developed. The first RF plasma generated with 2 kW power of 1 MHz frequency. More of the RF plasma tests and negative source relative research need to do in the future.

  14. Evaluation of surface damage on organic materials irradiated with Ar cluster ion beam

    NASA Astrophysics Data System (ADS)

    Yamamoto, Y.; Ichiki, K.; Ninomiya, S.; Seki, T.; Aoki, T.; Matsuo, J.

    2011-01-01

    The sputtering yields of organic materials under large cluster ion bombardment are much higher than those under conventional monomer ion bombardment. The sputtering rate of arginine remains constant with fluence for an Ar cluster ion beam, but decreases with fluence for Ar monomer. Additionally, because Ar cluster etching induces little damage, Ar cluster ion can be used to achieve molecular depth profiling of organic materials. In this study, we evaluated the damage to poly methyl methacrylate (PMMA) and arginine samples irradiated with Ar atomic and Ar cluster ion beams. Arginine samples were analyzed by secondary ion mass spectrometry (SIMS) and PMMA samples were analyzed by X-ray photoelectron spectroscopy (XPS). The chemical structure of organic materials remained unchanged after Ar cluster irradiation, but was seriously damaged. These results indicated that bombardment with Ar cluster ions induced less surface damage than bombardment with Ar atomic ion. The damage layer thickness with 5 keV Ar cluster ion bombardment was less than 1 nm.

  15. Progress and future developments of high current ion source for neutral beam injector in the ASIPP

    SciTech Connect

    Hu, Chundong; Xie, Yahong Xie, Yuanlai; Liu, Sheng; Liu, Zhimin; Xu, Yongjian; Liang, Lizhen; Sheng, Peng; Jiang, Caichao

    2015-04-08

    A high current hot cathode bucket ion source, which based on the US long pulse ion source is developed in Institute of Plasma Physics, Chinese Academy of Sciences. The ion source consists of a bucket plasma generator with multi-pole cusp fields and a set of tetrode accelerator with slit apertures. So far, four ion sources are developed and conditioned on the ion source test bed. 4 MW hydrogen beam with beam energy of 80 keV is extracted. In Aug. 2013, EAST NBI 1 with two ion source installed on the EAST, and achieved H-mode plasma with NBI injection for the first time. In order to achieve stable long pulse operation of high current ion source and negative ion source research, the RF ion source with 200 mm diameter and 120 mm depth driver is designed and developed. The first RF plasma generated with 2 kW power of 1 MHz frequency. More of the RF plasma tests and negative source relative research need to do in the future.

  16. Resonant excitation of waves by a spiraling ion beam on the large plasma device

    NASA Astrophysics Data System (ADS)

    Tripathi, Shreekrishna

    2015-11-01

    The resonant interaction between energetic-ions and plasma waves is a fundamental topic of importance in the space, controlled magnetic-fusion, and laboratory plasma physics. We report new results on the spontaneous generation of traveling shear Alfvén waves and high-harmonic beam-modes in the lower-hybrid range of frequencies by an intense ion beam. In particular, the role of Landau and Doppler-shifted ion-cyclotron resonances (DICR) in extracting the free-energy from the ion-beam and destabilizing Alfvén waves was explored on the Large Plasma Device (LAPD). In these experiments, single and dual-species magnetized plasmas (n ~1010 -1012 cm-3, Te ~ 5.0-10.0 eV, B = 0.6-1.8 kG, He+ and H+ ions, 19.0 m long, 0.6 m diameter) were produced and a spiraling hydrogen ion beam (5-15 keV, 2-10 A, beam-speed/Alfvén-speed = 0.2-1.5, J ~ 50-150 mA/cm2, pitch-angle ~53°) was injected into the plasma. The interaction of the beam with the plasma was diagnosed using a retarding-field energy analyzer, three-axis magnetic-loop, and Langmuir probes. The resonance conditions for the growth of shear Alfvén waves were examined by varying the parameters of the ion-beam and ambient plasma. The experimental results demonstrate that the DICR process is particularly effective in exciting left-handed polarized shear Alfvén waves that propagate in the direction opposite to the ion beam. The high-harmonic beam modes were detected in the vicinity of the spiraling ion beam and contained more than 80 harmonics of Doppler-shifted gyro-frequency of the beam. Work jointly supported by US DOE and NSF and performed at the Basic Plasma Science Facility, UCLA.

  17. Spontaneous excitation of waves by an intense ion beam on the Large Plasma Device

    NASA Astrophysics Data System (ADS)

    Tripathi, Shreekrishna; van Compernolle, Bart; Gekelman, Walter; Pribyl, Patrick; Heidbrink, William

    2016-10-01

    A hydrogen ion beam (15 keV, 10 A) has been injected into a large magnetized plasma (n 1010 -1013 cm-3, Te = 5.0 - 15.0 eV, B = 0.6 - 1.8 kG, He+ and H+ ions, 19 m long, 0.6 m diameter) for performing fast-ion studies on the Large Plasma Device (LAPD). The beam forms a helical orbit (pitch-angle 7° -55°), propagates with an Alfvénic speed (beam-speed/Alfvén-speed = 0.2 - 3.0), and significantly enhances the electron temperature and density when injected during the plasma afterglow. We report results on spontaneous generation of Alfvén waves and electrostatic waves in the lower-hybrid range of frequencies by the beam. Roles of normal and anomalous Doppler-shifted ion-cyclotron resonances in destabilizing the Alfvén waves were examined by measuring the phase-speed of waves and relevant parameters of the plasma using a variety of diagnostic tools (retarding-field energy analyzer, three-axis magnetic-loop, Dipole, and Langmuir probes). Conditions for the maximum growth of these waves were determined by varying the parameters of the beam and ambient plasma and examining the mode-structures in the fluctuation-spectra. Work jointly supported by US DOE and NSF and performed at the Basic Plasma Science Facility, UCLA.

  18. Methods and apparatus for altering material using ion beams

    DOEpatents

    Bloomquist, Douglas D.; Buchheit, Rudy; Greenly, John B.; McIntyre, Dale C.; Neau, Eugene L.; Stinnett, Regan W.

    1996-01-01

    A method and apparatus for treating material surfaces using a repetitively pulsed ion beam. In particular, a method of treating magnetic material surfaces in order to reduce surface defects, and produce amorphous fine grained magnetic material with properties that can be tailored by adjusting treatment parameters of a pulsed ion beam. In addition to a method of surface treating materials for wear and corrosion resistance using pulsed particle ion beams.

  19. Ion beam requirements for fast ignition of inertial fusion targets

    SciTech Connect

    Honrubia, J. J.; Murakami, M.

    2015-01-15

    Ion beam requirements for fast ignition are investigated by numerical simulation taking into account new effects, such as ion beam divergence, not included before. We assume that ions are generated by the TNSA scheme in a curved foil placed inside a re-entrant cone and focused on the cone apex or beyond. From the focusing point to the compressed core, ions propagate with a given divergence angle. Ignition energies are obtained for two compressed fuel configurations heated by proton and carbon ion beams. The dependence of the ignition energies on the beam divergence angle and on the position of the ion beam focusing point has been analyzed. Comparison between TNSA and quasi-monoenergetic ions is also shown.

  20. Ion beam probing of electrostatic fields

    NASA Technical Reports Server (NTRS)

    Persson, H.

    1979-01-01

    The determination of a cylindrically symmetric, time-independent electrostatic potential V in a magnetic field B with the same symmetry by measurements of the deflection of a primary beam of ions is analyzed and substantiated by examples. Special attention is given to the requirements on canonical angular momentum and total energy set by an arbitrary, nonmonotone V, to scaling laws obtained by normalization, and to the analogy with ionospheric sounding. The inversion procedure with the Abel analysis of an equivalent problem with a one-dimensional fictitious potential is used in a numerical experiment with application to the NASA Lewis Modified Penning Discharge. The determination of V from a study of secondary beams of ions with increased charge produced by hot plasma electrons is also analyzed, both from a general point of view and with application to the NASA Lewis SUMMA experiment. Simple formulas and geometrical constructions are given for the minimum energy necessary to reach the axis, the whole plasma, and any point in the magnetic field. The common, simplifying assumption that V is a small perturbation is critically and constructively analyzed; an iteration scheme for successively correcting the orbits and points of ionization for the electrostatic potential is suggested.

  1. The response of a fast phosphor screen scintillator (ZnO:Ga) to low energy ions (0-60 keV)

    SciTech Connect

    Jimenez-Rey, D.; Rodriguez-Barquero, L.

    2010-10-15

    ZnO:Ga is a promising, high time resolution candidate for use as a fast-ion-loss detector in TJ-II. We compare its ionoluminescence with that of the standard fast-ion-loss detector material, SrGa{sub 2}S{sub 4}:Eu (also known as TG-Green), when irradiated by H{sup +} ions with a range of energies E{<=}60 keV using a dedicated laboratory setup. It is found that ZnO:Ga is a reasonably good candidate for detecting low energy (E<60 keV) ions as it has excellent time resolution; however, its sensitivity is about 100 times lower than TG-Green, potentially limiting it to applications with high energy ion loss signals.

  2. Mass and energy distribution of negatively and positively charged small cluster ions sputtered from GaAs(100) by 150 keV Ar+ bombardment

    NASA Astrophysics Data System (ADS)

    Angelin, E. J.; Hippler, R.

    2017-09-01

    Mass and energy distribution of positively and negatively charged small GaxAsy cluster ions consisting of up to six atoms sputtered from a GaAs(100) surface after 150 keV Ar+ ion bombardment are reported. Positively charged ions contain a larger fraction of Ga atoms while negatively charged ions are rich in As. Measured energy distributions display a maximum at low kinetic energies of a few eV followed by a steep decrease with increasing energy which is more pronounced for larger ions.

  3. Study of nuclear reactions with carnon-11 and oxygen-15 radioactive ion beams

    NASA Astrophysics Data System (ADS)

    Lee, Dongwon

    Nuclear reaction study with radioactive ion beams is one of the most exciting research topics in modern nuclear physics. The development of radioactive ion beams has allowed nuclear scientists and engineers to explore many unknown exotic nuclei far from the valley of nuclear stability, and to further our understanding of the evolution of the universe. The recently developed radioactive ion beam facility at the Lawrence Berkeley National Laboratory's 88-inch cyclotron is denoted as BEARS and provides 11C, 14O and 15O radioactive ion beams of high quality. These moderate to high intensity, proton-rich radioactive ion beams have been used to explore the properties of unstable nuclei such as 12N and 15F. In this work, the proton capture reaction on 11C has been evaluated via the indirect d(11C,12N)n transfer reaction using the inverse kinematics method coupled with the Asymptotic Normalization Coefficient (ANC) theoretical approach. The total effective 12N→11C +p ANC is found to be C12Neff 2 = 1.83 +/- 0.27 fm-1. With the high 11C beam intensity available, our experiment showed excellent agreement with theoretical predictions and previous experimental studies. This study also indirectly confirmed that the 11C(p,gamma) reaction is a key step in producing CNO nuclei in supermassive low-metallicity stars, bypassing the slow triple alpha process. The newly developed 15O radioactive ion beam at BEARS was used to study the poorly known level widths of 16F via the p(15O,15O)p reaction. Among the nuclei in the A=16, T=1 isobaric triad, many states in 16N and 16O have been well established, but less has been reported on 16F. Four states of 16F below 1 MeV have been identified experimentally: 0-, 1-, 2-, and 3- (Ex = 0.0, 0.19, 0.42, and 0.72 MeV, respectively). Our study utilized R-matrix analysis and found that the 0- state has a level width of 23.1 +/- 2.2 keV, and that the broader 1 - state has a width of 91.1 +/- 9.9 keV. The level width of the 2- state is found to be 3

  4. Study of Nuclear Reactions with 11C and 15O Radioactive Ion Beams

    SciTech Connect

    Lee, Dongwon

    2007-05-14

    Nuclear reaction study with radioactive ion beams is one of the most exciting research topics in modern nuclear physics. The development of radioactive ion beams has allowed nuclear scientists and engineers to explore many unknown exotic nuclei far from the valley of nuclear stability, and to further our understanding of the evolution of the universe. The recently developed radioactive ion beam facility at the Lawrence Berkeley National Laboratory's 88-inch cyclotron is denoted as BEARS and provides 11C, 14O and 15O radioactive ion beams of high quality. These moderate to high intensity, proton-rich radioactive ion beams have been used to explore the properties of unstable nuclei such as 12N and 15F. In this work, the proton capture reaction on 11C has been evaluated via the indirect d(11C, 12N)n transfer reaction using the inverse kinematics method coupled with the Asymptotic Normalization Coefficient (ANC) theoretical approach. The total effective 12N → 11C+p ANC is found to be (C eff12N = 1.83 ± 0.27 fm-1. With the high 11C beam intensity available, our experiment showed excellent agreement with theoretical predictions and previous experimental studies. This study also indirectly confirmed that the 11C(p,γ) reaction is a key step in producing CNO nuclei in supermassive low-metallicity stars, bypassing the slow triple alpha process. The newly developed 15O radioactive ion beam at BEARS was used to study the poorly known level widths of 16F via the p(15O,15O)p reaction. Among the nuclei in the A=16, T=1 isobaric triad, many states in 16N and 16O have been well established, but less has been reported on 16F. Four states of 16F below 1 MeV have been identified experimentally: 0-, 1

  5. A new luminescence beam profile monitor for intense proton and heavy ion beams

    SciTech Connect

    Tsang,T.; Bellavia, S.; Connolly, R.; Gassner, D.; Makdisi, Y.; Russo, T.; Thieberger, P.; Trbojevic, D.; Zelenski, A.

    2008-10-01

    A new luminescence beam profile monitor is realized in the polarized hydrogen gas jet target at the Relativistic Heavy Ion Collider (RHIC) facility. In addition to the spin polarization of the proton beam being routinely measured by the hydrogen gas jet, the luminescence produced by beam-hydrogen excitation leads to a strong Balmer series lines emission. A selected hydrogen Balmer line is spectrally filtered and imaged to produce the transverse RHIC proton beam shape with unprecedented details on the RHIC beam profile. Alternatively, when the passage of the high energy RHIC gold ion beam excited only the residual gas molecules in the beam path, sufficient ion beam induced luminescence is produced and the transverse gold ion beam profile is obtained. The measured transverse beam sizes and the calculated emittances provide an independent confirmation of the RHIC beam characteristics and to verify the emittance conservation along the RHIC accelerator. This optical beam diagnostic technique by making use of the beam induced fluorescence from injected or residual gas offers a truly noninvasive particle beam characterization, and provides a visual observation of proton and heavy ion beams. Combined with a longitudinal bunch measurement system, a 3-dimensional spatial particle beam profile can be reconstructed tomographically.

  6. Ion Beam Sweeping using High Temperature Super Conducting Magnet

    SciTech Connect

    Sakai, Shigeki; Fujita, Hideki; King, Tom; Briggs, Neil; Miles, Matt; McCrohon, Mick; Gibson, Simon

    2011-01-07

    Advanced implantation systems used for semiconductor fabrication need to transport low energy ion beams. In this respect it is an advantage to employ a short beam line. Strong magnetic field in a compact footprint can enable shorter beam lines. In this work we report the use of a superconducting magnet to generate the strong magnetic field. We have developed a prototype superconducting AC magnet operating at frequencies of 80-156 Hz to sweep ion beams. We have studied the performance of ion beam sweeping using the AC superconducting magnet.

  7. Spacecraft charging during ion beam emissions in sunlight

    NASA Technical Reports Server (NTRS)

    Lai, S. T.; Mcneil, W. J.; Aggson, T. L.

    1990-01-01

    During ion beam emissions from the SCATHA satellite, the potential of the negatively charged satellite body shows a sinusoidal oscillation frequency of once-per-spin of the satellite. The minimum occurs when the ion beam is sunward. The processes that may be responsible for the voltage modulation are considered. Neutralization of ion beam space charge by photoelectrons is examined. The photoelectrons are accelerated by the negative potential of the satellite. Effects of electron impact ionization, excitation of metastable states, and photoionization of xenon neutral atoms in the ion beam are studied in detail. Critical ionization velocity interaction is unlikely under the condition considered.

  8. The prospects of a subnanometer focused neon ion beam.

    PubMed

    Rahman, F H M; McVey, Shawn; Farkas, Louis; Notte, John A; Tan, Shida; Livengood, Richard H

    2012-01-01

    The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various candidate ion beams and their technical prospects suggest that a neon beam might be the most readily achieved. Such a neon beam would provide a sputtering yield that exceeds helium by an order of magnitude while still offering a theoretical probe size less than 1-nm. This article outlines the motivation for a neon gas field ion source, the expected performance through simulations, and provides an update of our experimental progress. © Wiley Periodicals, Inc.

  9. Performance and Controllability of Pulsed Ion Beam Ablation Propulsion

    SciTech Connect

    Yazawa, Masaru; Buttapeng, Chainarong; Harada, Nobuhiro; Suematsu, Hisayuki; Jiang Weihua; Yatsui, Kiyoshi

    2006-05-02

    We propose novel propulsion driven by ablation plasma pressures produced by the irradiation of pulsed ion beams onto a propellant. The ion beam ablation propulsion demonstrates by a thin foil (50 {mu}mt), and the flyer velocity of 7.7 km/s at the ion beam energy density of 2 kJ/cm2 adopted by using the Time-of-flight method is observed numerically and experimentally. We estimate the performance of the ion beam ablation propulsion as specific impulse of 3600 s and impulse bit density of 1700 Ns/m2 obtained from the demonstration results. In the numerical analysis, a one-dimensional hydrodynamic model with ion beam energy depositions is used. The control of the ion beam kinetic energy is only improvement of the performance but also propellant consumption. The spacecraft driven by the ion beam ablation provides high performance efficiency with short-pulsed ion beam irradiation. The numerical results of the advanced model explained latent heat and real gas equation of state agreed well with experimental ones over a wide range of the incident ion beam energy density.

  10. DEVELOPMENT OF EMITTANCE ANALYSIS SOFTWARE FOR ION BEAM CHARACTERIZATION

    SciTech Connect

    Padilla, M. J.; Liu, Y.

    2007-01-01

    Transverse beam emittance is a crucial property of charged particle beams that describes their angular and spatial spread. It is a fi gure of merit frequently used to determine the quality of ion beams, the compatibility of an ion beam with a given beam transport system, and the ability to suppress neighboring isotopes at on-line mass separator facilities. Generally a high quality beam is characterized by a small emittance. In order to determine and improve the quality of ion beams used at the Holifi eld Radioactive Ion beam Facility (HRIBF) for nuclear physics and nuclear astrophysics research, the emittances of the ion beams are measured at the off-line Ion Source Test Facilities. In this project, emittance analysis software was developed to perform various data processing tasks for noise reduction, to evaluate root-mean-square emittance, Twiss parameters, and area emittance of different beam fractions. The software also provides 2D and 3D graphical views of the emittance data, beam profi les, emittance contours, and RMS. Noise exclusion is essential for accurate determination of beam emittance values. A Self-Consistent, Unbiased Elliptical Exclusion (SCUBEEx) method is employed. Numerical data analysis techniques such as interpolation and nonlinear fi tting are also incorporated into the software. The software will provide a simplifi ed, fast tool for comprehensive emittance analysis. The main functions of the software package have been completed. In preliminary tests with experimental emittance data, the analysis results using the software were shown to be accurate.

  11. Production of TeV-class photons via Compton back-scattering on proton beams of a keV high brilliance FEL

    NASA Astrophysics Data System (ADS)

    Serafini, L.; Broggi, F.; Curatolo, C.

    2017-07-01

    Present availability of high brilliance photon beams as those produced by X-ray Free Electron Lasers in combination with intense TeV proton beams like those available at SPS, LHC or in the future at FCC, makes possible to conceive the production of TeV-class photons by Compton back-scattering of keV photons carried by the FEL radiation pulse. We present here the study of spectra and fluxes of the TeV-class photons, which are collimated in the typical 1/ γ forward angle with respect to the propagation of the proton beam (γ is the proton beam relativistic factor). Using a room-temperature Linac based X-ray FEL delivering radiation pulses at 100 Hz up to 6 keV photon energy (implying a Linac electron beam energy in the 5-8 GeV range), fluxes of tens photons/s are achievable. It is also shown that a proper control of proton beam emittance and focusing at the interaction point is crucial to assure a reasonable energy spread of the photons emitted within an angle smaller than 1/ γ . Moreover, due to the reasonably small proton recoil, the back-scattering is actually in the Thomson regime, therefore the back-scattered photons retain the same polarization of the incident FEL beam (that is typically linear, but can be made circular too) even using unpolarized protons. The life-time of the proton beam circulating in the main ring is not affected at all by the interaction with the FEL beam due to the small number of Compton back-scattering events generated (maximum of 1 per bunch collision).

  12. Ion beam energy deposition physics for ICF targets

    SciTech Connect

    Mehlhorn, T.A.

    1980-01-01

    The target interaction physics of light ion beams will be described. The phenomenon of range shortening with increasing material temperature will be corroborated, and the concomittant phenomenon of range relengthening due to ion-electron decoupling will be introduced.

  13. Space Charge Neutralization of DEMO Relevant Negative Ion Beams at Low Gas Density

    SciTech Connect

    Surrey, Elizabeth; Porton, Michael

    2011-09-26

    The application of neutral beams to future power plant devices (DEMO) is dependent on achieving significantly improved electrical efficiency and the most promising route to achieving this is by implementing a photoneutralizer in place of the traditional gas neutralizer. A corollary of this innovation would be a significant reduction in the background gas density through which the beam is transported between the accelerator and the neutralizer. This background gas is responsible for the space charge neutralization of the beam, enabling distances of several metres to be traversed without significant beam expansion. This work investigates the sensitivity of a D{sup -} beam to reduced levels of space charge compensation for energies from 100 keV to 1.5 MeV, representative of a scaled prototype experiment, commissioning and full energy operation. A beam transport code, following the evolution of the phase space ellipse, is employed to investigate the effect of space charge on the beam optics. This shows that the higher energy beams are insensitive to large degrees of under compensation, unlike the lower energies. The probable degree of compensation at low gas density is then investigated through a simple, two component beam-plasma model that allows the potential to be negative. The degree of under-compensation is dependent on the positive plasma ion energy, one source of which is dissociation of the gas by the beam. The subsequent space charge state of the beam is shown to depend upon the relative times for equilibration of the dissociation energy and ionization by the beam ions.

  14. The response of the pyrochlore structure-type to ion-beam irradiation

    NASA Astrophysics Data System (ADS)

    Lian, Jie

    Pyrochlore with the general formula of A3+2B4+2O7 (Fd3m; Z = 8) has been proposed as the candidate waste form for the immobilization of actinides, particularly plutonium from dismantled nuclear weapons. Because actinides decay by alpha-decay events, radiation effects on the waste form are a concern. The effects of radiation on different pyrochlore compositions, A2B2O7 (A = La ˜ Lu, and Y; B = Ti, Sn, and Zr), have been investigated by 50 KeV He+, 600 KeV Ar+, 1.0 MeV Kr+, and 1.5 MeV Xe+ ion irradiations. Titanate pyrochlores are generally sensitive to ion beam damage and can be amorphized at a low damage level (˜0.2 dpa). The critical amorphization temperature, Tc, increases from ˜480 to ˜1120 K with increasing A-site cation size. A dramatically increasing radiation "resistance" to ion beam induced-amorphization has been observed with increasing Zr-content in the Gd2Ti2-xZrxO7 system. The pure end-member, Gd2Zr2O7, cannot be amorphized, even at doses as high as ˜100 dpa. Although zirconate pyrochlores are generally considered to be radiation "resistant", ion beam-induced amorphization occurs for La2Zr2O7 at a dose of ˜5.5 dpa at room temperature. Stannate pyrochlores A2Sn 2O7 (A = La, Nd, Gd) are readily amorphized by ion beam damage at a relatively low dose (˜1 dpa) at room temperature; while no evidence of amorphization has been observed in A2Sn2O7 (A = Er, Y, Lu) irradiated with 1 MeV Kr+ ions at a dose of ˜6 dpa at 25 K. The factors that influence the response of different pyrochlore compositions to ion irradiation-induced amorphization are discussed in terms of cation radius ratio, defect formation energies, and the tendency of the pyrochlore structure-type to undergo an order-disorder transition to the defect-fluorite structure. The "resistance" of the pyrochlore structure to ion beam-induced amorphization is not only affected by the relative sizes of the A- and B-site cations, but also the cation electronic configurations. Pyrochlore compositions

  15. CW/Pulsed H- ion beam generation with PKU Cs-free 2.45 GHz microwave driven ion source

    NASA Astrophysics Data System (ADS)

    Peng, S. X.; Ren, H. T.; Xu, Y.; Zhang, T.; Zhang, A. L.; Zhang, J. F.; Zhao, J.; Guo, Z. Y.; Chen, J. E.

    2015-04-01

    Circular accelerators used for positron emission tomography (PET, i.e. accelerator used for make radio isotopes) need several mA of CW H- ion beam for their routine operation. Other facilities, like Space Radio-Environment Simulate Assembly (SPRESA), require less than 10 mA pulsed mode H- beam. Caesium free negative hydrogen ion source is a good choice for those facilities because of its compact structure, easy operation and low cost. Up to now, there is no H- source able to produce very intense H- beams with important variation of the duty factor[1]. Recently, a new version of 2.45 GHz microwave H- ion source was designed at PKU, based on lessons learnt from the previous one. This non cesiated source is very compact thanks to its permanent magnet configuration. Special attention was paid on the design of the discharge chamber structure, electron dumping and extraction system. Source test to produce H- ion beams in pulsed and CW mode was carried out on PKU ion source test bench. In CW mode, a 10.8 mA/30keV H- beam with rms emittance about 0.16 π.mm.mrad has been obtained with only 500 W rf power. The power efficiency reaches 21 mA/kW. In pulsed mode with duty factor of 10% (100Hz/1ms), this compact source can easily deliver 20 mA H- ion beam at 35 keV with rms emittance about 0.2 π.mm.mrad when RF power is set at 2.2 kW (peak power). Several hour successive running operation in both modes and totaling more than 200 hours proves its high quality. The outside dimension of this new H- source body is ϕ116 mm × 124 mm, and the entire H- source infrastructure, including rf matching section, plasma chamber and extraction system, is ϕ310 × 180 mm. The high voltage region is limited with in a ϕ310 mm × 230 mm diagram. Details are given in this paper.

  16. Direct reaction measurements with a (132)Sn radioactive ion beam

    SciTech Connect

    Jones, K. L.; Chae, K. Y.; Kapler, R.; Ma, Zhanwen; Moazen, Brian; Cizewski, J. A.; Hatarik, Robert; Pain, S. D.; Swan, T. P.; Nunes, F. M.; Adekola, Aderemi S; Bardayan, Daniel W; Blackmon, Jeff C; Chae, Kyung Yuk; Liang, J Felix; Nesaraja, Caroline D; Pain, Steven D; Shapira, Dan; Smith, Michael Scott; Chipps, Kelly A; Erikson, Luke; Livesay, R. J.; Harlin, Christopher W; Patterson, N. P.; Thomas, J. S.; Kozub, R. L.; Shriner, Jr., John F

    2011-01-01

    The (d,p) neutron transfer and (d,d) elastic scattering reactions were measured in inverse kinematics using a radioactive ion beam of {sup 132}Sn at 630 MeV. The elastic scattering data were taken in a region where Rutherford scattering dominated the reaction, and nuclear effects account for less than 8% of the elastic scattering cross section. The magnitude of the nuclear effects, in the angular range studied, was found to be independent of the optical potential used, allowing the transfer data to be normalized in a reliable manner. The neutron-transfer reaction populated a previously unmeasured state at 1363 keV, which is most likely the single-particle 3p{sub 1/2} state expected above the N=82 shell closure. The data were analyzed using finite-range adiabatic-wave calculations and the results compared with the previous analysis using the distorted-wave Born approximation. Angular distributions for the ground and first-excited states are consistent with the previous tentative spin and parity assignments. Spectroscopic factors extracted from the differential cross sections are similar to those found for the one-neutron states beyond the benchmark doubly magic nucleus {sup 208}Pb.

  17. Direct reaction measurements with a 132Sn radioactive ion beam

    SciTech Connect

    Jones, Katherine L.; Nunes, Filomena M.; Adekola, Aderemi S.; Bardayan, Dan W.; Blackmon, Jeff; Chae, K. Y.; Chipps, Kelly A.; Cizewski, Jolie A.; Erikson, Luke E.; Harlin, C.; Hatarik, R.; Kapler, R.; Kozub, Raymond L.; Liang, J. F.; Livesay, Ronald J.; Ma, Zhongguo J.; Moazen, B. H.; Nesaraja, Caroline D.; Pain, Steven D.; Patterson, N. P.; Shapira, Dan; Shriner, Jr., John F.; Smith, Michael S.; Swan, Thomas P.; Thomas, Jeff S.

    2011-09-01

    The (d,p) neutron transfer and (d,d) elastic scattering reactions were measured in inverse kinematics using a radioactive ion beam of 132Sn at 630 MeV. The elastic scattering data were taken in a region where Rutherford scattering dominated the reaction, and nuclear effects account for less than 8% of the elastic scattering cross section. The magnitude of the nuclear effects, in the angular range studied, was found to be independent of the optical potential used, allowing the transfer data to be normalized in a reliable manner. The neutron-transfer reaction populated a previously unmeasured state at 1363 keV, which is most likely the single-particle 3p1/2 state expected above the N = 82 shell closure. The data were analyzed using finite-range adiabatic-wave calculations and the results compared with the previous analysis using the distorted-wave Born approximation. Angular distributions for the ground and first-excited states are consistent with the previous tentative spin and parity assignments. Spectroscopic factors extracted from the differential cross sections are similar to those found for the one-neutron states beyond the benchmark doubly magic nucleus 208Pb.

  18. Heavy ion beam-ionosphere interactions: Electron acceleration

    SciTech Connect

    Kaufmann, R.L.; Arnoldy, R.L.; Moore, T.E.; Kintner, P.M.; Cahill L.J. Jr.; Walker, D.N.

    1985-10-01

    Operation of a divergent 25-eV Ar/sup +/ gun within an auroral arc produced dramatic changes in the flux of electrons with energies between 1 keV and the 88-eV detector cutoff. The observations suggest that intense return currents flowed parallel to B/sub 0/ to neutralize the Ar/sup +/ beam, particularly within a few meters of the rocket. These neutralization currents were carried above and below the rocket by the few-eV electrons which were emitted by the gun and by colder ionospheric electrons. Such low-energy electrons could not be measured directly by detectors on the rocket. We concluded that generation of strong field-aligned return currents was the most important effect of ion gun operation, and that these field aligned currents were responsible for many other observable effects. Downgoing hectovolt electrons appear to have been accelerated because of interactions with waves or quasi-stationary electric fields that were generated by the field-aligned current. This acceleration took place throughout a cylinder centered on the rocket,with a radius of at least several meters. Acceleration of hectovolt electrons depended surprisingly little on the direction in which the Ar/sup +/ gun was pointing.

  19. Isotopic Composition of Boron Secondary Ions as a Function of Ion-Beam Fluence.

    NASA Astrophysics Data System (ADS)

    Baumel, Laurie Michelle

    The experiment performed in this work isolates and examines the effects of mass on the composition of the sputtered flux from a multi-component target. Chemical complexities are minimized by measuring sputtered ions from a target consisting only of two isotopes of one element. In this case, chemical effects as well as inter-atomic potentials are assumed to be identical for all constituents moving within the target, thus simplifying the target kinematics. Since any non-stoichiometry in the sputtered material should be caused only by the effects of mass on the kinetics in the target, measuring the sputtered material and comparing various analytical predictions with the experimental results leads to a better understanding of mass effects in these targets. 100-keV argon and neon were used to sputter an elemental target comprising the two naturally occurring isotopes of boron. The resulting secondary ions were examined with an electrostatic quadrupole mass analyzer. At low beam fluences (~1 times 20^{15} ions/cm ^2) a light-isotope secondary ion enhancement is observed relative to the steady-state secondary ion yields collected at higher beam fluences ( ~5 times 10 ^{17} ions/cm^2 ). The steady-state ion yields are representative of the bulk composition of the target. The enhancement (46.1perthous for Ne^+ irradiation and 51.8perthous for Ar^+ irradiation) is large compared to the predictions of analytical theories and is determined to be independent of variations in surface potential, chemical effects, and surface impurities. This effect is consistent with an explanation based on an energy and momentum asymmetry in the collision cascade. The asymmetry was caused by an extra collision mechanism which allowed light particles to backscatter 180^circ (towards the target surface) from underlying heavier target particles whereas the reverse process can not occur. When irradiated with projectiles heavier than the target constituents, the heavier target particles had a higher

  20. Microdosimetry in ion-beam therapy

    NASA Astrophysics Data System (ADS)

    Magrin, Giulio; Mayer, Ramona

    2015-05-01

    The information of the dose is not sufficiently describing the biological effects of ions on tissue since it does not express the radiation quality, i.e. the heterogeneity of the processes due to the slowing-down and the fragmentation of the particles when crossing a target. Depending on different circumstances, the radiation quality can be determined using measurements, calculations, or simulations. Microdosimeters are the primary tools used to provide the experimental information of the radiation quality and their role is becoming crucial for the recent clinical developments in particular with carbon ion therapy. Microdosimetry is strongly linked to the biological effectiveness of the radiation since it provides the physical parameters which explicitly distinguish the radiation for its capability of damaging cells. In the framework of ion-beam therapy microdosimetry can be used in the preparation of the treatment to complement radiobiological experiments and to analyze the modification of the radiation quality in phantoms. A more ambitious goal is to perform the measurements during the irradiation procedure to determine the non-targeted radiation and, more importantly, to monitor the modification of the radiation quality inside the patient. These procedures provide the feedback of the treatment directly beneficial for the single patient but also for the characterization of the biological effectiveness in general with advantages for all future treatment. Traditional and innovative tools are currently under study and an outlook of present experience and future development is presented here.