CONTROL OF CHELATOR-BASED UPSETS IN SURFACE FINISHING SHOP WASTE WATER TREATMENT SYSTEMS

EPA Science Inventory

Actual surface finishing shop examples are used to illustrate the use of process chemistry understanding and analyses to identify immediate, interim and permanent response options for industrial waste water treatment plant (IWTP) upset problems caused by chelating agents. There i...

Testing For EM Upsets In Aircraft Control Computers

NASA Technical Reports Server (NTRS)

Belcastro, Celeste M.

1994-01-01

Effects of transient electrical signals evaluated in laboratory tests. Method of evaluating nominally fault-tolerant, aircraft-type digital-computer-based control system devised. Provides for evaluation of susceptibility of system to upset and evaluation of integrity of control when system subjected to transient electrical signals like those induced by electromagnetic (EM) source, in this case lightning. Beyond aerospace applications, fault-tolerant control systems becoming more wide-spread in industry; such as in automobiles. Method supports practical, systematic tests for evaluation of designs of fault-tolerant control systems.

Hostile Attributional Bias, Negative Emotional Responding, and Aggression in Adults: Moderating Effects of Gender and Impulsivity

PubMed Central

Chen, Pan; Coccaro, Emil F.; Jacobson, Kristen C.

2012-01-01

The current study examined the main effects of hostile attributional bias (HAB) and negative emotional responding on a variety of aggressive behaviors in adults, including general aggression, physical aggression, relational aggression, and verbal aggression. Effects of both externalizing (anger) and internalizing (embarrassment/upset) negative emotions were considered. In addition, the moderating roles of gender and impulsivity on the effects of HAB and negative emotional responding were explored. Multilevel models were fitted to data from 2,749 adult twins aged 20–55 from the PennTwins cohort. HAB was positively associated with all four forms of aggression. There was also a significant interaction between impulsivity and HAB for general aggression. Specifically, the relationship between HAB and general aggression was only significant for individuals with average or above-average levels of impulsivity. Negative emotional responding was also found to predict all measures of aggression, although in different ways. Anger was positively associated with all forms of aggression, whereas embarrassment/upset predicted decreased levels of general, physical, and verbal aggression but increased levels of relational aggression. The associations between negative emotional responding and aggression were generally stronger for males than females. The current study provides evidence for the utility of HAB and negative emotional responding as predictors of adult aggression and further suggests that gender and impulsivity may moderate their links with aggression. PMID:24833604

Hostile attributional bias, negative emotional responding, and aggression in adults: moderating effects of gender and impulsivity.

PubMed

Chen, Pan; Coccaro, Emil F; Jacobson, Kristen C

2012-01-01

The current study examined the main effects of hostile attributional bias (HAB) and negative emotional responding on a variety of aggressive behaviors in adults, including general aggression, physical aggression, relational aggression, and verbal aggression. Effects of both externalizing (anger) and internalizing (embarrassment/upset) negative emotions were considered. In addition, the moderating roles of gender and impulsivity on the effects of HAB and negative emotional responding were explored. Multilevel models were fitted to data from 2,749 adult twins aged 20-55 from the PennTwins cohort. HAB was positively associated with all four forms of aggression. There was also a significant interaction between impulsivity and HAB for general aggression. Specifically, the relationship between HAB and general aggression was only significant for individuals with average or above-average levels of impulsivity. Negative emotional responding was also found to predict all measures of aggression, although in different ways. Anger was positively associated with all forms of aggression, whereas embarrassment/upset predicted decreased levels of general, physical, and verbal aggression but increased levels of relational aggression. The associations between negative emotional responding and aggression were generally stronger for males than females. The current study provides evidence for the utility of HAB and negative emotional responding as predictors of adult aggression and further suggests that gender and impulsivity may moderate their links with aggression. © 2011 Wiley Periodicals, Inc.

Airplane Upset Training Evaluation Report

NASA Technical Reports Server (NTRS)

Gawron, Valerie J.; Jones, Patricia M. (Technical Monitor)

2002-01-01

Airplane upset accidents are a leading factor in hull losses and fatalities. This study compared five types of airplane-upset training. Each group was composed of eight, non-military pilots flying in their probationary year for airlines operating in the United States. The first group, 'No aero / no upset,' was made up of pilots without any airplane upset training or aerobatic flight experience; the second group, 'Aero/no upset,' of pilots without any airplane-upset training but with aerobatic experience; the third group, 'No aero/upset,' of pilots who had received airplane-upset training in both ground school and in the simulator; the fourth group, 'Aero/upset,' received the same training as Group Three but in addition had aerobatic flight experience; and the fifth group, 'In-flight' received in-flight airplane upset training using an instrumented in-flight simulator. Recovery performance indicated that clearly training works - specifically, all 40 pilots recovered from the windshear upset. However few pilots were trained or understood the use of bank to change the direction of the lift vector to recover from nose high upsets. Further, very few thought of, or used differential thrust to recover from rudder or aileron induced roll upsets. In addition, recovery from icing-induced stalls was inadequate.

Laboratory test methodology for evaluating the effects of electromagnetic disturbances on fault-tolerant control systems

NASA Technical Reports Server (NTRS)

Belcastro, Celeste M.

1989-01-01

Control systems for advanced aircraft, especially those with relaxed static stability, will be critical to flight and will, therefore, have very high reliability specifications which must be met for adverse as well as nominal operating conditions. Adverse conditions can result from electromagnetic disturbances caused by lightning, high energy radio frequency transmitters, and nuclear electromagnetic pulses. Tools and techniques must be developed to verify the integrity of the control system in adverse operating conditions. The most difficult and illusive perturbations to computer based control systems caused by an electromagnetic environment (EME) are functional error modes that involve no component damage. These error modes are collectively known as upset, can occur simultaneously in all of the channels of a redundant control system, and are software dependent. A methodology is presented for performing upset tests on a multichannel control system and considerations are discussed for the design of upset tests to be conducted in the lab on fault tolerant control systems operating in a closed loop with a simulated plant.

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system

NASA Technical Reports Server (NTRS)

Carreno, Victor A.; Choi, G.; Iyer, R. K.

1990-01-01

A simulation study is described which predicts the susceptibility of an advanced control system to electrical transients resulting in logic errors, latched errors, error propagation, and digital upset. The system is based on a custom-designed microprocessor and it incorporates fault-tolerant techniques. The system under test and the method to perform the transient injection experiment are described. Results for 2100 transient injections are analyzed and classified according to charge level, type of error, and location of injection.

Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

NASA Technical Reports Server (NTRS)

Berg, Melanie; Label, Kenneth; Campola, Michael; Xapsos, Michael

2017-01-01

We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.

Effects of Cognitive Complexity and Emotional Upset on Processing Supportive Messages: Two Tests of a Dual-Process Theory of Supportive Communication Outcomes

ERIC Educational Resources Information Center

Bodie, Graham D.; Burleson, Brant R.; Holmstrom, Amanda J.; McCullough, Jennifer D.; Rack, Jessica J.; Hanasono, Lisa K.; Rosier, Jennifer G.

2011-01-01

We report tests of hypotheses derived from a theory of supportive communication outcomes that maintains the effects of supportive messages are moderated by factors influencing the motivation and ability to process these messages. Participants in two studies completed a measure of cognitive complexity, which provided an assessment of processing…

78 FR 77611 - Special Conditions: Airbus, A350-900 Series Airplane; High Speed Protection System

Federal Register 2010, 2011, 2012, 2013, 2014

2013-12-24

... protected by the flight control laws from getting into non- symmetric upset conditions. The proposed special... the airplane is protected by the flight control laws from getting into non-symmetric upset conditions... standards that the Administrator considers necessary to establish a level of safety equivalent to that...

Uncertainty Modeling for Robustness Analysis of Control Upset Prevention and Recovery Systems

NASA Technical Reports Server (NTRS)

Belcastro, Christine M.; Khong, Thuan H.; Shin, Jong-Yeob; Kwatny, Harry; Chang, Bor-Chin; Balas, Gary J.

2005-01-01

Formal robustness analysis of aircraft control upset prevention and recovery systems could play an important role in their validation and ultimate certification. Such systems (developed for failure detection, identification, and reconfiguration, as well as upset recovery) need to be evaluated over broad regions of the flight envelope and under extreme flight conditions, and should include various sources of uncertainty. However, formulation of linear fractional transformation (LFT) models for representing system uncertainty can be very difficult for complex parameter-dependent systems. This paper describes a preliminary LFT modeling software tool which uses a matrix-based computational approach that can be directly applied to parametric uncertainty problems involving multivariate matrix polynomial dependencies. Several examples are presented (including an F-16 at an extreme flight condition, a missile model, and a generic example with numerous crossproduct terms), and comparisons are given with other LFT modeling tools that are currently available. The LFT modeling method and preliminary software tool presented in this paper are shown to compare favorably with these methods.

Analysis of the Radiated Field in an Electromagnetic Reverberation Chamber as an Upset-Inducing Stimulus for Digital Systems

NASA Technical Reports Server (NTRS)

Torres-Pomales, Wilfredo

2012-01-01

Preliminary data analysis for a physical fault injection experiment of a digital system exposed to High Intensity Radiated Fields (HIRF) in an electromagnetic reverberation chamber suggests a direct causal relation between the time profile of the field strength amplitude in the chamber and the severity of observed effects at the outputs of the radiated system. This report presents an analysis of the field strength modulation induced by the movement of the field stirrers in the reverberation chamber. The analysis is framed as a characterization of the discrete features of the field strength waveform responsible for the faults experienced by a radiated digital system. The results presented here will serve as a basis to refine the approach for a detailed analysis of HIRF-induced upsets observed during the radiation experiment. This work offers a novel perspective into the use of an electromagnetic reverberation chamber to generate upset-inducing stimuli for the study of fault effects in digital systems.

Single-event upset in advanced commercial power PC microprocessors

NASA Technical Reports Server (NTRS)

Irom, F.; Farmanesh, F.; Swift, G. M.; Johnston, A. H.

2003-01-01

Single-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.

Calculation of Cosmic Ray Induced Single Event Upsets: Program CRUP, Cosmic Ray Upset Program

DTIC Science & Technology

1983-09-14

1.., 0 .j ~ u M ~ t R A’- ~~ ’ .~ ; I .: ’ 1 J., ) ’- CALCULATION OF COSMIC RAY INDUCED SINGLE EVEI’o"T UPSETS: PROGRAM CRUP , COSMIC RAY UPSET...neceuety end Identity by blo..;k number) 0Thls report documents PROGR.Al\\1 CRUP , COSMIC RAY UPSET PROGRAM. The computer program calculates cosmic...34. » » •-, " 1 » V »1T"~ Calculation of Cosmic Ray Induced Single Event Upsets: PROGRAM CRUP , COSMIC RAY UPSET PROGRAM I. INTRODUCTION Since the

Laser Scanner Tests For Single-Event Upsets

NASA Technical Reports Server (NTRS)

Kim, Quiesup; Soli, George A.; Schwartz, Harvey R.

1992-01-01

Microelectronic advanced laser scanner (MEALS) is opto/electro/mechanical apparatus for nondestructive testing of integrated memory circuits, logic circuits, and other microelectronic devices. Multipurpose diagnostic system used to determine ultrafast time response, leakage, latchup, and electrical overstress. Used to simulate some of effects of heavy ions accelerated to high energies to determine susceptibility of digital device to single-event upsets.

Application of Fault-Tolerant Computing For Spacecraft Using Commercial-Off-The-Shelf Microprocessors

DTIC Science & Technology

2000-06-01

real - time operating system and design of a human-computer interface (HCI) for a triple modular redundant (TMR) fault-tolerant microprocessor for use in space-based applications. Once disadvantage of using COTS hardware components is their susceptibility to the radiation effects present in the space environment. and specifically, radiation-induced single-event upsets (SEUs). In the event of an SEU, a fault-tolerant system can mitigate the effects of the upset and continue to process from the last known correct system state. The TMR basic hardware

Markov Jump-Linear Performance Models for Recoverable Flight Control Computers

NASA Technical Reports Server (NTRS)

Zhang, Hong; Gray, W. Steven; Gonzalez, Oscar R.

2004-01-01

Single event upsets in digital flight control hardware induced by atmospheric neutrons can reduce system performance and possibly introduce a safety hazard. One method currently under investigation to help mitigate the effects of these upsets is NASA Langley s Recoverable Computer System. In this paper, a Markov jump-linear model is developed for a recoverable flight control system, which will be validated using data from future experiments with simulated and real neutron environments. The method of tracking error analysis and the plan for the experiments are also described.

The Nuclear Weapons Effects National Enterprise

DTIC Science & Technology

2010-06-01

dependent on computers and electrical circuitry for effectiveness. The danger from radiation induced upset or burnout of improperly or unshielded...for Unmanned Systems Radiation Effect Thermal mechanical shock - X-ray Prompt X-ray/gamma dose rate - Rail-span collapse - Photoionization burnout ...event upset (SEU) or even single-event burnout . SEU results when enough ionization charge is deposited by a high-energy particle (natural or man

Reprogrammable field programmable gate array with integrated system for mitigating effects of single event upsets

NASA Technical Reports Server (NTRS)

Ng, Tak-kwong (Inventor); Herath, Jeffrey A. (Inventor)

2010-01-01

An integrated system mitigates the effects of a single event upset (SEU) on a reprogrammable field programmable gate array (RFPGA). The system includes (i) a RFPGA having an internal configuration memory, and (ii) a memory for storing a configuration associated with the RFPGA. Logic circuitry programmed into the RFPGA and coupled to the memory reloads a portion of the configuration from the memory into the RFPGA's internal configuration memory at predetermined times. Additional SEU mitigation can be provided by logic circuitry on the RFPGA that monitors and maintains synchronized operation of the RFPGA's digital clock managers.

Flight-test experience of a helicopter encountering an airplane trailing vortex

NASA Technical Reports Server (NTRS)

Dunham, R. E., Jr.; Holbrook, G. T.; Campbell, R. L.; Van Gunst, R. W.; Mantay, W. R.

1976-01-01

This paper presents results of a flight-test experiment of a UH-1H helicopter encountering the vortex wake of a C-54 airplane. The helicopter was instrumented to record the pilot control inputs, determine the upset experience, and measure critical loads within the rotor system. During the flight-test program 132 penetrations of the vortex wake were made by the helicopter at separation distances from 3/8 to 6-1/2 nautical miles. Test results indicated that the helicopter upsets and the vortex induced blade loads experienced were minimal and well within safe limits. The upsets were very mild when compared to a typical response of a small airplane to the vortex wake of the C-54 airplane.

Sub-Saharan Africa Report

DTIC Science & Technology

1987-03-23

Lusitania Market, in Esturro, the reporter was unable to learn how many customers were to be served, because the proprietor was out, but he was able to...atory. But fear of upsetting the moderates is obviously far out-weighed by fear of losing the support of the party hard- liners , a choice of...if Botha’s siding with the hard- liners is pure eve-of-election _ politicking, he is playing in an extremely dangerous game. If his hope is to

Frequency Dependence of Single-Event Upset in Highly Advanced PowerPC Microprocessors

NASA Technical Reports Server (NTRS)

Irom, Farokh; Farmanesh, Farhad; White, Mark; Kouba, Coy K.

2006-01-01

Single-event upset effects from heavy ions were measured for Motorola silicon-on-insulator (SOI) microprocessor with 90 nm feature sizes at three frequencies of 500, 1066 and 1600 MHz. Frequency dependence of single-event upsets is discussed. The results of our studies suggest the single-event upset in registers and D-Cache tend to increase with frequency. This might have important implications for the overall single-event upset trend as technology moves toward higher frequencies.

NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing

NASA Technical Reports Server (NTRS)

Berg, Melanie; Label, Kenneth; Campola, Michael; Pellish, Jonathan

2017-01-01

This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independent Single Event Upset (SEU) Field Programmable Gate Array (FPGA) testing including FPGA test guidelines, Microsemi RTG4 heavy-ion results, Xilinx Kintex-UltraScale heavy-ion results, Xilinx UltraScale+ single event effect (SEE) test plans, development of a new methodology for characterizing SEU system response, and NEPP involvement with FPGA security and trust.

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

NASA Technical Reports Server (NTRS)

Chen, Dakai; Wilcox, Edward; Ladbury, Raymond L.; Kim, Hak; Phan, Anthony; Seidleck, Christina; Label, Kenneth

2016-01-01

We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found that the single-event upset (SEU) cross section varied inversely with cumulative fluence. We attribute the effect to the variable upset sensitivities of the memory cells. Furthermore, the effect impacts only single cell upsets in general. The rate of multiple-bit upsets remained relatively constant with fluence. The current test standards and procedures assume that SEU follow a Poisson process and do not take into account the variability in the error rate with fluence. Therefore, traditional SEE testing techniques may underestimate the on-orbit event rate for a device with variable upset sensitivity.

Aircraft Flight Envelope Determination using Upset Detection and Physical Modeling Methods

NASA Technical Reports Server (NTRS)

Keller, Jeffrey D.; McKillip, Robert M. Jr.; Kim, Singwan

2009-01-01

The development of flight control systems to enhance aircraft safety during periods of vehicle impairment or degraded operations has been the focus of extensive work in recent years. Conditions adversely affecting aircraft flight operations and safety may result from a number of causes, including environmental disturbances, degraded flight operations, and aerodynamic upsets. To enhance the effectiveness of adaptive and envelope limiting controls systems, it is desirable to examine methods for identifying the occurrence of anomalous conditions and for assessing the impact of these conditions on the aircraft operational limits. This paper describes initial work performed toward this end, examining the use of fault detection methods applied to the aircraft for aerodynamic performance degradation identification and model-based methods for envelope prediction. Results are presented in which a model-based fault detection filter is applied to the identification of aircraft control surface and stall departure failures/upsets. This application is supported by a distributed loading aerodynamics formulation for the flight dynamics system reference model. Extensions for estimating the flight envelope due to generalized aerodynamic performance degradation are also described.

Simulator study of vortex encounters by a twin-engine, commercial, jet transport airplane

NASA Technical Reports Server (NTRS)

Hastings, E. C., Jr.; Keyser, G. L., Jr.

1982-01-01

A simulator study of vortex encounters was conducted for a twin-engine, commercial, jet transport airplane encountering the vortex flow field of a heavy, four-engine, commercial, jet transport airplane in the final-approach configuration. The encounters were conducted with fixed controls and with a pilot using a state-of-the-art, manual-control system. Piloted encounters with the base-line vortex flow field out of ground effect (unattenuated) resulted in initial bank-angle excursions greater than 40 deg, coupled with initial sideslip-angle excursions greater than 10 deg. The severity of these initial upsets was significantly reduced when the vortex center was moved laterally or vertically away from the flight path of the encountering airplane. Smaller reductions occurred when the flow field was attenuated by the flight spoilers on the generating airplane. The largest reduction in the severity of the initial upsets, however, was from aging in ground effect. The severity of the initial upsets of the following airplane was relatively unaffected by the approach speed. Increasing the lift coefficient of the generating airplane resulted in an increase in the severity of the initial upsets.

Tradeoffs in Flight Design Upset Mitigation in State of the Art FPGAs: Hardened by Design vs. Design Level Hardening

NASA Technical Reports Server (NTRS)

Swift, Gary M.; Roosta, Ramin

2004-01-01

This presentation compares and contrasts the effectiveness and the system/designer impacts of the two main approaches to upset hardening: the Actel approach (RTSX-S and RTAX-S) of low-level (inside each flip-flop) triplication and the Xilinx approach (Virtex and Virtex2) of design-level triplication of both functional blocks and voters. The effectiveness of these approaches is compared using measurements made in conjunction with each of the FPGAs' manufacturer: for Actel, published data [1] and for Xilinx, recent results from the Xilinx SEE Test Consortium (note that the author is an active and founding member). The impacts involve Actel advantages in the areas of transistor-utilization efficiency and minimizing designer involvement in the triplication while the Xilinx advantages relate to the ability to custom tailor upset hardness and the flexibility of re-configurability. Additionally, there are currently clear Xilinx advantages in available features such as the number of I/O's, logic cells, and RAM blocks as well as speed. However, the advantage of the Actel anti-fuses for configuration over the Xilinx SRAM cells is that the latter need additional functionality and external circuitry (PROMs and, at least a watchdog timer) for configuration and configuration scrubbing. Further, although effectively mitigated if done correctly, the proton upset-ability of the Xilinx FPGAs is a concern in severe proton-rich environments. Ultimately, both manufacturers' upset hardening is limited by SEFI (single-event functional interrupt) rates where it appears the Actel results are better although the Xilinx Virtex2-family result of about one SEFI in 65 device-years in solar-min GCR (the more intense part of the galactic cosmic-ray background) should be acceptable to most missions

Self-reported stomach upset in travellers on cruise-based and land-based package holidays.

PubMed

Launders, Naomi J; Nichols, Gordon L; Cartwright, Rodney; Lawrence, Joanne; Jones, Jane; Hadjichristodoulou, Christos

2014-01-01

International travellers are at a risk of infectious diseases not seen in their home country. Stomach upsets are common in travellers, including on cruise ships. This study compares the incidence of stomach upsets on land- and cruise-based holidays. A major British tour operator has administered a Customer Satisfaction Questionnaire (CSQ) to UK resident travellers aged 16 or more on return flights from their holiday abroad over many years. Data extracted from the CSQ was used to measure self-reported stomach upset in returning travellers. From summer 2000 through winter 2008, 6,863,092 questionnaires were completed; 6.6% were from cruise passengers. A higher percentage of land-based holiday-makers (7.2%) reported stomach upset in comparison to 4.8% of cruise passengers (RR = 1.5, p<0.0005). Reported stomach upset on cruises declined over the study period (7.1% in 2000 to 3.1% in 2008, p<0.0005). Over 25% of travellers on land-based holidays to Egypt and the Dominican Republic reported stomach upset. In comparison, the highest proportion of stomach upset in cruise ship travellers were reported following cruises departing from Egypt (14.8%) and Turkey (8.8%). In this large study of self-reported illness both demographic and holiday choice factors were shown to play a part in determining the likelihood of developing stomach upset while abroad. There is a lower cumulative incidence and declining rates of stomach upset in cruise passengers which suggest that the cruise industry has adopted operations (e.g. hygiene standards) that have reduced illness over recent years.

Self-Reported Stomach Upset in Travellers on Cruise-Based and Land-Based Package Holidays

PubMed Central

Launders, Naomi J.; Nichols, Gordon L.; Cartwright, Rodney; Lawrence, Joanne; Jones, Jane; Hadjichristodoulou, Christos

2014-01-01

Background International travellers are at a risk of infectious diseases not seen in their home country. Stomach upsets are common in travellers, including on cruise ships. This study compares the incidence of stomach upsets on land- and cruise-based holidays. Methods A major British tour operator has administered a Customer Satisfaction Questionnaire (CSQ) to UK resident travellers aged 16 or more on return flights from their holiday abroad over many years. Data extracted from the CSQ was used to measure self-reported stomach upset in returning travellers. Results From summer 2000 through winter 2008, 6,863,092 questionnaires were completed; 6.6% were from cruise passengers. A higher percentage of land-based holiday-makers (7.2%) reported stomach upset in comparison to 4.8% of cruise passengers (RR = 1.5, p<0.0005). Reported stomach upset on cruises declined over the study period (7.1% in 2000 to 3.1% in 2008, p<0.0005). Over 25% of travellers on land-based holidays to Egypt and the Dominican Republic reported stomach upset. In comparison, the highest proportion of stomach upset in cruise ship travellers were reported following cruises departing from Egypt (14.8%) and Turkey (8.8%). Conclusions In this large study of self-reported illness both demographic and holiday choice factors were shown to play a part in determining the likelihood of developing stomach upset while abroad. There is a lower cumulative incidence and declining rates of stomach upset in cruise passengers which suggest that the cruise industry has adopted operations (e.g. hygiene standards) that have reduced illness over recent years. PMID:24427271

Formulation of a strategy for monitoring control integrity in critical digital control systems

NASA Technical Reports Server (NTRS)

Belcastro, Celeste M.; Fischl, Robert; Kam, Moshe

1991-01-01

Advanced aircraft will require flight critical computer systems for stability augmentation as well as guidance and control that must perform reliably in adverse, as well as nominal, operating environments. Digital system upset is a functional error mode that can occur in electromagnetically harsh environments, involves no component damage, can occur simultaneously in all channels of a redundant control computer, and is software dependent. A strategy is presented for dynamic upset detection to be used in the evaluation of critical digital controllers during the design and/or validation phases of development. Critical controllers must be able to be used in adverse environments that result from disturbances caused by an electromagnetic source such as lightning, high intensity radiated field (HIRF), and nuclear electromagnetic pulses (NEMP). The upset detection strategy presented provides dynamic monitoring of a given control computer for degraded functional integrity that can result from redundancy management errors and control command calculation error that could occur in an electromagnetically harsh operating environment. The use is discussed of Kalman filtering, data fusion, and decision theory in monitoring a given digital controller for control calculation errors, redundancy management errors, and control effectiveness.

Single-event upset in advanced PowerPC microprocessors

NASA Technical Reports Server (NTRS)

Irom, F.; Swift, G. M.; Farmanesh, F.; Millward, D. G.

2002-01-01

Proton and heavy-ion single-event upset susceptibility has been measured for the MotorolaPowerPC7400. The results show that this advanced device has low upset susceptibility, despite the scaling and design advances.

Electron-induced single event upsets in 28 nm and 45 nm bulk SRAMs

DOE PAGES

Trippe, J. M.; Reed, R. A.; Austin, R. A.; ...

2015-12-01

In this study, we present experimental evidence of single electron-induced upsets in commercial 28 nm and 45 nm CMOS SRAMs from a monoenergetic electron beam. Upsets were observed in both technology nodes when the SRAM was operated in a low power state. The experimental cross section depends strongly on both bias and technology node feature size, consistent with previous work in which SRAMs were irradiated with low energy muons and protons. Accompanying simulations demonstrate that δ-rays produced by the primary electrons are responsible for the observed upsets. Additional simulations predict the on-orbit event rates for various Earth and Jovian environmentsmore » for a set of sensitive volumes representative of current technology nodes. The electron contribution to the total upset rate for Earth environments is significant for critical charges as high as 0.2 fC. This value is comparable to that of sub-22 nm bulk SRAMs. Similarly, for the Jovian environment, the electron-induced upset rate is larger than the proton-induced upset rate for critical charges as high as 0.3 fC.« less

Calculation of cosmic ray induced single event upsets: Program CRUP (Cosmic Ray Upset Program)

NASA Astrophysics Data System (ADS)

Shapiro, P.

1983-09-01

This report documents PROGRAM CRUP, COSMIC RAY UPSET PROGRAM. The computer program calculates cosmic ray induced single-event error rates in microelectronic circuits exposed to several representative cosmic-ray environments.

Review of Research On Guidance for Recovery from Pitch Axis Upsets

NASA Technical Reports Server (NTRS)

Harrison, Stephanie J.

2016-01-01

A literature review was conducted to identify past efforts in providing control guidance for aircraft upset recovery including stall recovery. Because guidance is integrally linked to the intended function of aircraft attitude awareness and upset recognition, it is difficult, if not impossible, to consider these issues separately. This literature review covered the aspects of instrumentation and display symbologies for attitude awareness, aircraft upset recognition, upset and stall alerting, and control guidance. Many different forms of symbology have been investigated including, but not limited to, pitch scale depictions, attitude indicator icons, horizon symbology, attitude recovery arrows, and pitch trim indicators. Past research on different visual and alerting strategies that provide advisories, cautions, and warnings to pilots before entering an unusual attitude (UA) are also discussed. Finally, potential control guidance for recovery from upset or unusual attitudes, including approach-to-stall and stall conditions, are reviewed. Recommendations for future research are made.

Envelope Protection and Recovery Guidance for Upset Conditions

NASA Technical Reports Server (NTRS)

Lombaerts, Thomas; Schuet, Stefan; Acosta, Diana; Kaneshige, John; Shish, Kim

2016-01-01

The slides are an overview and summary of past and current research projects in the field of envelope protection, upset prevention and upset recovery, with the aim to avoid loss of control accidents and improve safety in air transportation.

Impact of Active Control on Passive Safety Response Characteristics of Sodium-Cooled Fast Reactors: II-Model Implementation and Simulations

DOE Office of Scientific and Technical Information (OSTI.GOV)

Ponciroli, Roberto; Passerini, Stefano; Vilim, Richard B.

Advanced reactors are often claimed to be passively safe against unprotected upset events. In common practice, these events are not considered in the context of the plant control system, i.e., the reactor is subjected to classes of unprotected upset events while the normally programmed response of the control system is assumed not to be present. However, this approach constitutes an oversimplification since, depending on the upset involving the control system, an actuator does not necessarily go in the same direction as needed for safety. In this work, dynamic simulations are performed to assess the degree to which the inherent self-regulatingmore » plant response is safe from active control system override. The simulations are meant to characterize the resilience of the plant to unprotected initiators. The initiators were represented and modeled as an actuator going to a hard limit. Consideration of failure is further limited to individual controllers as there is no cross-connect of signals between these controllers. The potential for passive safety override by the control system is then relegated to the single-input single-output controllers. Here, the results show that when the plant control system is designed by taking into account and quantifying the impact of the plant control system on accidental scenarios there is very limited opportunity for the preprogrammed response of the control system to override passive safety protection in the event of an unprotected initiator.« less

Impact of Active Control on Passive Safety Response Characteristics of Sodium-Cooled Fast Reactors: II-Model Implementation and Simulations

DOE PAGES

Ponciroli, Roberto; Passerini, Stefano; Vilim, Richard B.

2017-06-21

Advanced reactors are often claimed to be passively safe against unprotected upset events. In common practice, these events are not considered in the context of the plant control system, i.e., the reactor is subjected to classes of unprotected upset events while the normally programmed response of the control system is assumed not to be present. However, this approach constitutes an oversimplification since, depending on the upset involving the control system, an actuator does not necessarily go in the same direction as needed for safety. In this work, dynamic simulations are performed to assess the degree to which the inherent self-regulatingmore » plant response is safe from active control system override. The simulations are meant to characterize the resilience of the plant to unprotected initiators. The initiators were represented and modeled as an actuator going to a hard limit. Consideration of failure is further limited to individual controllers as there is no cross-connect of signals between these controllers. The potential for passive safety override by the control system is then relegated to the single-input single-output controllers. Here, the results show that when the plant control system is designed by taking into account and quantifying the impact of the plant control system on accidental scenarios there is very limited opportunity for the preprogrammed response of the control system to override passive safety protection in the event of an unprotected initiator.« less

Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors

NASA Technical Reports Server (NTRS)

Irom, Frokh; Farmanesh, Farhad F.; Swift, Gary M.; Johnston, Allen H.

2004-01-01

This paper examines single-event upsets in advanced commercial SOI microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency. Results are presented for SOI processors with feature sizes of 0.18 microns and two different core voltages. Single-event upset from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequency up to 1GHz. Frequency and core voltage dependence of single-event upsets in registers is discussed.

40 CFR 403.16 - Upset provision.

Code of Federal Regulations, 2013 CFR

2013-07-01

... 40 Protection of Environment 30 2013-07-01 2012-07-01 true Upset provision. 403.16 Section 403.16 Protection of Environment ENVIRONMENTAL PROTECTION AGENCY (CONTINUED) EFFLUENT GUIDELINES AND STANDARDS GENERAL PRETREATMENT REGULATIONS FOR EXISTING AND NEW SOURCES OF POLLUTION § 403.16 Upset provision. (a...

DOE Office of Scientific and Technical Information (OSTI.GOV)

Trippe, J. M.; Reed, R. A.; Austin, R. A.

In this study, we present experimental evidence of single electron-induced upsets in commercial 28 nm and 45 nm CMOS SRAMs from a monoenergetic electron beam. Upsets were observed in both technology nodes when the SRAM was operated in a low power state. The experimental cross section depends strongly on both bias and technology node feature size, consistent with previous work in which SRAMs were irradiated with low energy muons and protons. Accompanying simulations demonstrate that δ-rays produced by the primary electrons are responsible for the observed upsets. Additional simulations predict the on-orbit event rates for various Earth and Jovian environmentsmore » for a set of sensitive volumes representative of current technology nodes. The electron contribution to the total upset rate for Earth environments is significant for critical charges as high as 0.2 fC. This value is comparable to that of sub-22 nm bulk SRAMs. Similarly, for the Jovian environment, the electron-induced upset rate is larger than the proton-induced upset rate for critical charges as high as 0.3 fC.« less

An SEU immune logic family

NASA Technical Reports Server (NTRS)

Canaris, J.

1991-01-01

A new logic family, which is immune to single event upsets, is described. Members of the logic family are capable of recovery, regardless of the shape of the upsetting event. Glitch propagation from an upset node is also blocked. Logic diagrams for an Inverter, Nor, Nand, and Complex Gates are provided. The logic family can be implemented in a standard, commercial CMOS process with no additional masks. DC, transient, static power, upset recovery and layout characteristics of the new family, based on a commercial 1 micron CMOS N-Well process, are described.

Turbulence flight director analysis and preliminary simulation

NASA Technical Reports Server (NTRS)

Johnson, D. E.; Klein, R. E.

1974-01-01

A control column and trottle flight director display system is synthesized for use during flight through severe turbulence. The column system is designed to minimize airspeed excursions without overdriving attitude. The throttle system is designed to augment the airspeed regulation and provide an indication of the trim thrust required for any desired flight path angle. Together they form an energy management system to provide harmonious display indications of current aircraft motions and required corrective action, minimize gust upset tendencies, minimize unsafe aircraft excursions, and maintain satisfactory ride qualities. A preliminary fixed-base piloted simulation verified the analysis and provided a shakedown for a more sophisticated moving-base simulation to be accomplished next. This preliminary simulation utilized a flight scenario concept combining piloting tasks, random turbulence, and discrete gusts to create a high but realistic pilot workload conducive to pilot error and potential upset. The turbulence director (energy management) system significantly reduced pilot workload and minimized unsafe aircraft excursions.

Upset Over Sexual versus Emotional Infidelity Among Gay, Lesbian, Bisexual, and Heterosexual Adults.

PubMed

Frederick, David A; Fales, Melissa R

2016-01-01

One hypothesis derived from evolutionary perspectives is that men are more upset than women by sexual infidelity and women are more upset than men by emotional infidelity. The proposed explanation is that men, in contrast to women, face the risk of unwittingly investing in genetically unrelated offspring. Most studies, however, have relied on small college or community samples of heterosexual participants. We examined upset over sexual versus emotional jealousy among 63,894 gay, lesbian, bisexual, and heterosexual participants. Participants imagined which would upset them more: their partners having sex with someone else (but not falling in love with them) or their partners falling in love with someone else (but not having sex with them). Consistent with this evolutionary perspective, heterosexual men were more likely than heterosexual women to be upset by sexual infidelity (54 vs. 35 %) and less likely than heterosexual women to be upset by emotional infidelity (46 vs. 65 %). This gender difference emerged across age groups, income levels, history of being cheated on, history of being unfaithful, relationship type, and length. The gender difference, however, was limited to heterosexual participants. Bisexual men and women did not differ significantly from each other in upset over sexual infidelity (30 vs. 27 %), regardless of whether they were currently dating a man (35 vs. 29 %) or woman (28 vs. 20 %). Gay men and lesbian women also did not differ (32 vs. 34 %). The findings present strong evidence that a gender difference exists in a broad sample of U.S. adults, but only among heterosexuals.

Chronic Stress is Prospectively Associated with Sleep in Midlife Women: The SWAN Sleep Study.

PubMed

Hall, Martica H; Casement, Melynda D; Troxel, Wendy M; Matthews, Karen A; Bromberger, Joyce T; Kravitz, Howard M; Krafty, Robert T; Buysse, Daniel J

2015-10-01

Evaluate whether levels of upsetting life events measured over a 9-y period prospectively predict subjective and objective sleep outcomes in midlife women. Prospective cohort study. Four sites across the United States. 330 women (46-57 y of age) enrolled in the Study of Women's Health Across the Nation (SWAN) Sleep Study. N/A. Upsetting life events were assessed annually for up to 9 y. Trajectory analysis applied to life events data quantitatively identified three distinct chronic stress groups: low stress, moderate stress, and high stress. Sleep was assessed by self-report and in-home polysomnography (PSG) during the ninth year of the study. Multivariate analyses tested the prospective association between chronic stress group and sleep, adjusting for race, baseline sleep complaints, marital status, body mass index, symptoms of depression, and acute life events at the time of the Sleep Study. Women characterized by high chronic stress had lower subjective sleep quality, were more likely to report insomnia, and exhibited increased PSG-assessed wake after sleep onset (WASO) relative to women with low to moderate chronic stress profiles. The effect of chronic stress group on WASO persisted in the subsample of participants without baseline sleep complaints. Chronic stress is prospectively associated with sleep disturbance in midlife women, even after adjusting for acute stressors at the time of the sleep study and other factors known to disrupt sleep. These results are consistent with current models of stress that emphasize the cumulative effect of stressors on health over time. © 2015 Associated Professional Sleep Societies, LLC.

Dynamics Modeling and Simulation of Large Transport Airplanes in Upset Conditions

NASA Technical Reports Server (NTRS)

Foster, John V.; Cunningham, Kevin; Fremaux, Charles M.; Shah, Gautam H.; Stewart, Eric C.; Rivers, Robert A.; Wilborn, James E.; Gato, William

2005-01-01

As part of NASA's Aviation Safety and Security Program, research has been in progress to develop aerodynamic modeling methods for simulations that accurately predict the flight dynamics characteristics of large transport airplanes in upset conditions. The motivation for this research stems from the recognition that simulation is a vital tool for addressing loss-of-control accidents, including applications to pilot training, accident reconstruction, and advanced control system analysis. The ultimate goal of this effort is to contribute to the reduction of the fatal accident rate due to loss-of-control. Research activities have involved accident analyses, wind tunnel testing, and piloted simulation. Results have shown that significant improvements in simulation fidelity for upset conditions, compared to current training simulations, can be achieved using state-of-the-art wind tunnel testing and aerodynamic modeling methods. This paper provides a summary of research completed to date and includes discussion on key technical results, lessons learned, and future research needs.

Comparison of heavy-ion- and electron-beam upset data for GaAS SRAMS. Technical report

DOE Office of Scientific and Technical Information (OSTI.GOV)

Flesner, L.D.; Zuleeg, R.; Kolasinski, W.A.

1992-07-16

We report the results of experiments designed to evaluate the extent to which focused electron-beam pulses simulate energetic ion upset phenomena in GaAs memory circuits fabricated by the McDonnell Douglas Astronautics Company. The results of two experimental methods were compared, irradiation by heavy-ion particle beams, and upset mapping using focused electron pulses. Linear energy transfer (LET) thresholds and upset cross sections are derived from the data for both methods. A comparison of results shows good agreement, indicating that for these circuits electron-beam pulse mapping is a viable simulation technique.

High electrical resistivity Nd-Fe-B die-upset magnet doped with eutectic DyF3-LiF salt mixture

NASA Astrophysics Data System (ADS)

Kim, K. M.; Kim, J. Y.; Kwon, H. W.; Kim, D. H.; Lee, J. G.; Yu, J. H.

2017-05-01

Nd-Fe-B-type die-upset magnet with high electrical resistivity was prepared by doping of eutectic DyF3-LiF salt mixture. Mixture of melt-spun Nd-Fe-B flakes (MQU-F: Nd13.6Fe73.6Co6.6Ga0.6B5.6) and eutectic binary (DyF3-LiF) salt (25 mol% DyF3 - 75 mol% LiF) was hot-pressed and then die-upset. By adding the eutectic salt mixture (> 4 wt%), electrical resistivity of the die-upset magnet was enhanced to over 400 μ Ω .cm compared to 190 μ Ω .cm of the un-doped magnet. Remarkable enhancement of the electrical resistivity was attributed to homogeneous and continuous coverage of the interface between flakes by the easily melted eutectic salt dielectric mixture. It was revealed that active substitution of the Nd atoms in neighboring flakes by the Dy atoms from the added (DyF3-LiF) salt mixture had occurred during such a quick thermal processing of hot-pressing and die-upsetting. This Dy substitution led to coercivity enhancement in the die-upset magnet doped with the eutectic (DyF3-LiF) salt mixture. Coercivity and remanence of the die-upset magnet doped with (DyF3-LiF) salt mixture was as good as those of the DyF3-doped magnet.

Electronics Shielding and Reliability Design Tools

NASA Technical Reports Server (NTRS)

Wilson, John W.; ONeill, P. M.; Zang, Thomas A., Jr.; Pandolf, John E.; Koontz, Steven L.; Boeder, P.; Reddell, B.; Pankop, C.

2006-01-01

It is well known that electronics placement in large-scale human-rated systems provides opportunity to optimize electronics shielding through materials choice and geometric arrangement. For example, several hundred single event upsets (SEUs) occur within the Shuttle avionic computers during a typical mission. An order of magnitude larger SEU rate would occur without careful placement in the Shuttle design. These results used basic physics models (linear energy transfer (LET), track structure, Auger recombination) combined with limited SEU cross section measurements allowing accurate evaluation of target fragment contributions to Shuttle avionics memory upsets. Electronics shielding design on human-rated systems provides opportunity to minimize radiation impact on critical and non-critical electronic systems. Implementation of shielding design tools requires adequate methods for evaluation of design layouts, guiding qualification testing, and an adequate follow-up on final design evaluation including results from a systems/device testing program tailored to meet design requirements.

An Approach for the Assessment of System Upset Resilience

NASA Technical Reports Server (NTRS)

Torres-Pomales, Wilfredo

2013-01-01

This report describes an approach for the assessment of upset resilience that is applicable to systems in general, including safety-critical, real-time systems. For this work, resilience is defined as the ability to preserve and restore service availability and integrity under stated conditions of configuration, functional inputs and environmental conditions. To enable a quantitative approach, we define novel system service degradation metrics and propose a new mathematical definition of resilience. These behavioral-level metrics are based on the fundamental service classification criteria of correctness, detectability, symmetry and persistence. This approach consists of a Monte-Carlo-based stimulus injection experiment, on a physical implementation or an error-propagation model of a system, to generate a system response set that can be characterized in terms of dimensional error metrics and integrated to form an overall measure of resilience. We expect this approach to be helpful in gaining insight into the error containment and repair capabilities of systems for a wide range of conditions.

Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits

NASA Technical Reports Server (NTRS)

Buehler, Martin G. (Inventor); Nixon, Robert H. (Inventor); Soli, George A. (Inventor); Blaes, Brent R. (Inventor)

1995-01-01

A method for predicting the SEU susceptibility of a standard-cell D-latch using an alpha-particle sensitive SRAM, SPICE critical charge simulation results, and alpha-particle interaction physics. A technique utilizing test structures to quickly and inexpensively characterize the SEU sensitivity of standard cell latches intended for use in a space environment. This bench-level approach utilizes alpha particles to induce upsets in a low LET sensitive 4-k bit test SRAM. This SRAM consists of cells that employ an offset voltage to adjust their upset sensitivity and an enlarged sensitive drain junction to enhance the cell's upset rate.

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets of NAND Flash Memory

NASA Technical Reports Server (NTRS)

Chen, Dakai; Wilcox, Edward; Ladbury, Raymond; Kim, Hak; Phan, Anthony; Seidleck, Christina; LaBel, Kenneth

2016-01-01

We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found the single-event upset (SEU) cross section varied inversely with fluence. The SEU cross section decreased with increasing fluence. We attribute the effect to the variable upset sensitivities of the memory cells. The current test standards and procedures assume that SEU follow a Poisson process and do not take into account the variability in the error rate with fluence. Therefore, heavy ion irradiation of devices with variable upset sensitivity distribution using typical fluence levels may underestimate the cross section and on-orbit event rate.

Corticosteroids

MedlinePlus

... include behavior change, increased appetite, acne, thrush (a yeast infection in the mouth), stomach upset, or trouble ... long-term systemic use. They may include a yeast infection in the mouth or hoarseness. The risk ...

Results and Insights on the Impact of Smoke on Digital Instrumentation and Control

DOE Office of Scientific and Technical Information (OSTI.GOV)

Tanaka, T. J.; Nowlen, S. P.

2001-01-31

Smoke can cause interruptions and upsets in active electronics. Because nuclear power plants are replacing analog with digital instrumentation and control systems, qualification guidelines for new systems are being reviewed for severe environments such as smoke and electromagnetic interference. Active digital systems, individual components, and active circuits have been exposed to smoke in a program sponsored by the U.S. Nuclear Regulatory Commission. The circuits and systems were all monitored during the smoke exposure, indicating any immediate effects of the smoke. The major effect of smoke has been to increase leakage currents (through circuit bridging across contacts and leads) and tomore » cause momentary upsets and failures in digital systems. This report summarizes two previous reports and presents new results from conformal coating, memory chip, and hard drive tests. The report describes practices for mitigation of smoke damage through digital system design, fire barriers, ventilation, fire suppressants, and post fire procedures.« less

Analysis of space radiation data of semiconductor memories

NASA Technical Reports Server (NTRS)

Stassinopoulos, E. G.; Brucker, G. J.; Stauffer, C. A.

1996-01-01

This article presents an analysis of radiation effects for several select device types and technologies aboard the Combined Release and Radiation Effects Satellite (CRRES) satellite. These space-flight measurements covered a period of about 14 months of mission lifetime. Single Event Upset (SEU) data of the investigated devices from the Microelectronics Package (MEP) were processed and analyzed. Valid upset measurements were determined by correcting for invalid readings, hard failures, missing data tapes (thus voids in data), and periods over which devices were disabled from interrogation. The basic resolution time of the measurement system was confirmed to be 2 s. Lessons learned, important findings, and recommendations are presented.

Results from the First Two Flights of the Static Computer Memory Integrity Testing Experiment

NASA Technical Reports Server (NTRS)

Hancock, Thomas M., III

1999-01-01

This paper details the scientific objectives, experiment design, data collection method, and post flight analysis following the first two flights of the Static Computer Memory Integrity Testing (SCMIT) experiment. SCMIT is designed to detect soft-event upsets in passive magnetic memory. A soft-event upset is a change in the logic state of active or passive forms of magnetic memory, commonly referred to as a "Bitflip". In its mildest form a soft-event upset can cause software exceptions, unexpected events, start spacecraft safeing (ending data collection) or corrupted fault protection and error recovery capabilities. In it's most severe form loss of mission or spacecraft can occur. Analysis after the first flight (in 1991 during STS-40) identified possible soft-event upsets to 25% of the experiment detectors. Post flight analysis after the second flight (in 1997 on STS-87) failed to find any evidence of soft-event upsets. The SCMIT experiment is currently scheduled for a third flight in December 1999 on STS-101.

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory

NASA Technical Reports Server (NTRS)

Chen, Dakai; Wilcox, Edward; Ladbury, Raymond; Seidleck, Christina; Kim, Hak; Phan, Anthony; Label, Kenneth

2017-01-01

We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode. The 3D NAND showed significantly reduced SEU susceptibility in single-level-cell (SLC) storage mode. Additionally, the 3D NAND showed less multiple-bit upset susceptibility than the planar NAND, with fewer number of upset bits per byte and smaller cross sections overall. However, the 3D architecture exhibited angular sensitivities for both base and face angles, reflecting the anisotropic nature of the SEU vulnerability in space. Furthermore, the SEU cross section decreased with increasing fluence for both the 3D NAND and the Micron 16 nm planar NAND, which suggests that typical heavy ion test fluences will underestimate the upset rate during a space mission. These unique characteristics introduce complexity to traditional ground irradiation test procedures.

Caregiver Appraisals of Functional Dependence in Individuals With Dementia and Associated Caregiver Upset: Psychometric Properties of a New Scale and Response Patterns by Caregiver and Care Recipient Characteristics

PubMed Central

GITLIN, LAURA N.; ROTH, DAVID L.; BURGIO, LOUIS D.; LOEWENSTEIN, DAVID A.; WINTER, LARAINE; NICHOLS, LINDA; ARGÜELLES, SOLEDAD; CORCORAN, MARY; BURNS, ROBERT; MARTINDALE, JENNIFER

2008-01-01

Objective To evaluate psychometric properties and response patterns of the Caregiver Assessment of Function and Upset (CAFU), a 15-item multidimensional measure of dependence in dementia patients and caregiver reaction. Method 640 families were administered the CAFU (53% White, 43% African American, and 4% mixed race and ethnicity). We created a random split of the sample and conducted exploratory factor analyses on Sample 1 and confirmatory factor analyses on Sample 2. Convergent and discriminant validity were evaluated using Spearman rank correlation coefficients. Results A two-factor structure for functional items was derived, and excellent factorial validity was obtained. Convergent and discriminant validity were obtained for function and upset measures. Differential response patterns for dependence and caregiver upset were found for caregiver race, relationship, and care recipient gender but not for caregiver gender. Discussion The CAFU is easily administered, reliable, and valid for evaluating appraisals of dependencies and upsetting care areas. PMID:15750049

Crying without a cause and being easily upset in two-year-olds: heritability and predictive power of behavioral problems.

PubMed

Groen-Blokhuis, Maria M; Middeldorp, Christel M; M van Beijsterveldt, Catharina E; Boomsma, Dorret I

2011-10-01

In order to estimate the influence of genetic and environmental factors on 'crying without a cause' and 'being easily upset' in 2-year-old children, a large twin study was carried out. Prospective data were available for ~18,000 2-year-old twin pairs from the Netherlands Twin Register. A bivariate genetic analysis was performed using structural equation modeling in the Mx software package. The influence of maternal personality characteristics and demographic and lifestyle factors was tested to identify specific risk factors that may underlie the shared environment of twins. Furthermore, it was tested whether crying without a cause and being easily upset were predictive of later internalizing, externalizing and attention problems. Crying without a cause yielded a heritability estimate of 60% in boys and girls. For easily upset, the heritability was estimated at 43% in boys and 31% in girls. The variance explained by shared environment varied between 35% and 63%. The correlation between crying without a cause and easily upset (r = .36) was explained both by genetic and shared environmental factors. Birth cohort, gestational age, socioeconomic status, parental age, parental smoking behavior and alcohol use during pregnancy did not explain the shared environmental component. Neuroticism of the mother explained a small proportion of the additive genetic, but not of the shared environmental effects for easily upset. Crying without a cause and being easily upset at age 2 were predictive of internalizing, externalizing and attention problems at age 7, with effect sizes of .28-.42. A large influence of shared environmental factors on crying without a cause and easily upset was detected. Although these effects could be specific to these items, we could not explain them by personality characteristics of the mother or by demographic and lifestyle factors, and we recognize that these effects may reflect other maternal characteristics. A substantial influence of genetic factors was found for the two items, which are predictive of later behavioral problems.

Single event upset susceptibilities of latchup immune CMOS process programmable gate arrays

NASA Astrophysics Data System (ADS)

Koga, R.; Crain, W. R.; Crawford, K. B.; Hansel, S. J.; Lau, D. D.; Tsubota, T. K.

Single event upsets (SEU) and latchup susceptibilities of complementary metal oxide semiconductor programmable gate arrays (CMOS PPGA's) were measured at the Lawrence Berkeley Laboratory 88-in. cyclotron facility with Xe (603 MeV), Cu (290 MeV), and Ar (180 MeV) ion beams. The PPGA devices tested were those which may be used in space. Most of the SEU measurements were taken with a newly constructed tester called the Bus Access Storage and Comparison System (BASACS) operating via a Macintosh II computer. When BASACS finds that an output does not match a prerecorded pattern, the state of all outputs, position in the test cycle, and other necessary information is transmitted and stored in the Macintosh. The upset rate was kept between 1 and 3 per second. After a sufficient number of errors are stored, the test is stopped and the total fluence of particles and total errors are recorded. The device power supply current was closely monitored to check for occurrence of latchup. Results of the tests are presented, indicating that some of the PPGA's are good candidates for selected space applications.

General upper bound on single-event upset rate. [due to ionizing radiation in orbiting vehicle avionics

NASA Technical Reports Server (NTRS)

Chlouber, Dean; O'Neill, Pat; Pollock, Jim

1990-01-01

A technique of predicting an upper bound on the rate at which single-event upsets due to ionizing radiation occur in semiconducting memory cells is described. The upper bound on the upset rate, which depends on the high-energy particle environment in earth orbit and accelerator cross-section data, is given by the product of an upper-bound linear energy-transfer spectrum and the mean cross section of the memory cell. Plots of the spectrum are given for low-inclination and polar orbits. An alternative expression for the exact upset rate is also presented. Both methods rely only on experimentally obtained cross-section data and are valid for sensitive bit regions having arbitrary shape.

Loss of Control Prevention and Recovery: Onboard Guidance, Control, and Systems Technologies

NASA Technical Reports Server (NTRS)

Belcastro, Christine M.

2012-01-01

Loss of control (LOC) is one of the largest contributors to fatal aircraft accidents worldwide. LOC accidents are complex in that they can result from numerous causal and contributing factors acting alone or (more often) in combination. These LOC hazards include vehicle impairment conditions, external disturbances; vehicle upset conditions, and inappropriate crew actions or responses. Hence, there is no single intervention strategy to prevent these accidents. NASA previously defined a comprehensive research and technology development approach for reducing LOC accidents and an associated integrated system concept. Onboard technologies for improved situation awareness, guidance, and control for LOC prevention and recovery are needed as part of this approach. Such systems should include: LOC hazards effects detection and mitigation; upset detection, prevention and recovery; and mitigation of combined hazards. NASA is conducting research in each of these areas. This paper provides an overview of this research, including the near-term LOC focus and associated analysis, as well as preliminary flight system architecture.

Single-Event Upset Characterization of Common First- and Second-Order All-Digital Phase-Locked Loops

NASA Astrophysics Data System (ADS)

Chen, Y. P.; Massengill, L. W.; Kauppila, J. S.; Bhuva, B. L.; Holman, W. T.; Loveless, T. D.

2017-08-01

The single-event upset (SEU) vulnerability of common first- and second-order all-digital-phase-locked loops (ADPLLs) is investigated through field-programmable gate array-based fault injection experiments. SEUs in the highest order pole of the loop filter and fraction-based phase detectors (PDs) may result in the worst case error response, i.e., limit cycle errors, often requiring system restart. SEUs in integer-based linear PDs may result in loss-of-lock errors, while SEUs in bang-bang PDs only result in temporary-frequency errors. ADPLLs with the same frequency tuning range but fewer bits in the control word exhibit better overall SEU performance.

Characterizing the Hazard of a Wake Vortex Encounter

NASA Technical Reports Server (NTRS)

Vicroy, Dan D.; Brandon, Jay; Greene, George; Rivers, Robert; Shah, Gautam; Stewart, Eric; Stuever, Robert

1998-01-01

The National Aeronautics and Space Administration (NASA) is conducting research with the goal of enabling safe improvements in the capacity of the nation's air transportation system. The wake vortex upset hazard is an important factor in establishing the minimum safe spacing between aircraft during landing and take-off operations, thus impacting airport capacity. Static and free-flight wind tunnel tests and flight tests have provided an extensive data set for improved understanding of vortex encounter dynamics and simulation. Piloted and batch simulation studies are also ongoing to establish a first-order hazard metric and determine the limits of an operationally acceptable wake induced upset. This paper outlines NASA's research in these areas.

Single event induced transients in I/O devices - A characterization

NASA Technical Reports Server (NTRS)

Newberry, D. M.; Kaye, D. H.; Soli, G. A.

1990-01-01

The results of single-event upset (SEU) testing performed to evaluate the parametric transients, i.e., amplitude and duration, in several I/O devices, and the impact of these transients are discussed. The failure rate of these devices is dependent on the susceptibility of interconnected devices to the resulting transient change in the output of the I/O device. This failure rate, which is a function of the susceptibility of the interconnected device as well as the SEU response of the I/O device itself, may be significantly different from an upset rate calculated without taking these factors into account. The impact at the system level is discussed by way of an example.

An Experiment to Evaluate Transfer of Low-Cost Simulator-Based Upset-Recovery Training

DTIC Science & Technology

2009-03-01

nclusve, LOC was the leadng cause of hull losses and passenger fataltes n worldwde ar transport operatons, causng almost 25% of all crashes ...research at the Calspan In-Flght Upset Recovery Tranng Program n Roswell , N.M.4 A second set of artcles focuses on centrfuge-based flght s...resulted n ar transport upsets leadng to uncontrolled crashes . Gawron used Calspan’s Learjet to test five groups of arlne plots wth varyng

GaAs MMIC: recovery from upset by x-ray pulse

DOE Office of Scientific and Technical Information (OSTI.GOV)

Armendariz, M.G.; Castle, J.G. Jr.

1986-01-01

Tolerance for fast neutrons and total ionizing dose is a feature of GaAs microwave monolithic integrated circuits (MMIC). However, upset during an ionizing pulse is expected to occur and delayed recovery due to backgating may be a problem. The purpose of this study of an experimental MMIC design is to observe the recovery of oscillator power output following upset by a short ionizing pulse as a function of applied bias, dose per pulse and case temperature.

Flight Simulator and Training Human Factors Validation

NASA Technical Reports Server (NTRS)

Glaser, Scott T.; Leland, Richard

2009-01-01

Loss of control has been identified as the leading cause of aircraft accidents in recent years. Efforts have been made to better equip pilots to deal with these types of events, commonly referred to as upsets. A major challenge in these endeavors has been recreating the motion environments found in flight as the majority of upsets take place well beyond the normal operating envelope of large aircraft. The Environmental Tectonics Corporation has developed a simulator motion base, called GYROLAB, that is capable of recreating the sustained accelerations, or G-forces, and motions of flight. A two part research study was accomplished that coupled NASA's Generic Transport Model with a GYROLAB device. The goal of the study was to characterize physiological effects of the upset environment and to demonstrate that a sustained motion based simulator can be an effective means for upset recovery training. Two groups of 25 Air Transport Pilots participated in the study. The results showed reliable signs of pilot arousal at specific stages of similar upsets. Further validation also demonstrated that sustained motion technology was successful in improving pilot performance during recovery following an extensive training program using GYROLAB technology.

The measurement and prediction of proton upset

NASA Astrophysics Data System (ADS)

Shimano, Y.; Goka, T.; Kuboyama, S.; Kawachi, K.; Kanai, T.

1989-12-01

The authors evaluate tolerance to proton upset for three kinds of memories and one microprocessor unit for space use by irradiating them with high-energy protons up to nearly 70 MeV. They predict the error rates of these memories using a modified semi-empirical equation of Bendel and Petersen (1983). A two-parameter method was used instead of Bendel's one-parameter method. There is a large difference between these two methods with regard to the fitted parameters. The calculation of upset rates in orbits were carried out using these parameters and NASA AP8MAC, AP8MIC. For the 93419 RAM the result of this calculation was compared with the in-orbit data taken on the MOS-1 spacecraft. A good agreement was found between the two sets of upset-rate data.

Preliminary Results of an Experiment to Evaluate Transfer of Low-Cost, Simulator-Based Airplane Upset-Recovery Training

DTIC Science & Technology

2007-10-01

Research Society World Conference, Nagoya, Japan, (May 2006): Rogers-NR17, pp. 2-4. 3 R.O. Rogers (2005). “The Crash of American Airlines Flight 587...at Roswell , N. M.4 This FAA-funded program provides upset training in an aerobatic Beech Bonanza and in Calspan’s variable stability Learjet 25, an...aviator with 14 years’ experience fl ying carrier based jet airplanes, attended Calspan upset training in Roswell in 2003 and can personally vouch for

An Experiment to Evaluate Transfer of Upset-Recovery Training Conducted Using Two Different Flight Simulation Devices

DTIC Science & Technology

2009-09-01

air transport operations, causing almost 25% of all crashes and nearly 40% of all fatalities.1 During the years 1991 - 2000, statistics for general...several reports result from research at the Calspan In-Flight Upset-Recovery Training Program in Roswell , Nm.5 a second set of articles focuses on...resulted in air transport upsets leading to uncontrolled crashes . gawron used Calspan’s Learjet to test five groups of airline pilots with varying

Single-Event Upsets Caused by High-Energy Protons

NASA Technical Reports Server (NTRS)

Price, W. E.; Nichols, D. K.; Smith, L. S.; Soli, G. A.

1986-01-01

Heavy secondary ions do not significantly alter device responses. Conclusion that external reaction products cause no significant alteration of single-event-upset response based on comparison of data obtained from both lidded and unlidded devices and for proton beams impinging at angles ranging from 0 degrees to 180 degrees with respect to chip face. Study also found single-event-upset cross section increases only modestly as proton energy increased to 590 MeV, characteristic of maximum energies expected in belts of trapped protons surrounding Earth and Jupiter.

Closed-Loop HIRF Experiments Performed on a Fault Tolerant Flight Control Computer

NASA Technical Reports Server (NTRS)

Belcastro, Celeste M.

1997-01-01

ABSTRACT Closed-loop HIRF experiments were performed on a fault tolerant flight control computer (FCC) at the NASA Langley Research Center. The FCC used in the experiments was a quad-redundant flight control computer executing B737 Autoland control laws. The FCC was placed in one of the mode-stirred reverberation chambers in the HIRF Laboratory and interfaced to a computer simulation of the B737 flight dynamics, engines, sensors, actuators, and atmosphere in the Closed-Loop Systems Laboratory. Disturbances to the aircraft associated with wind gusts and turbulence were simulated during tests. Electrical isolation between the FCC under test and the simulation computer was achieved via a fiber optic interface for the analog and discrete signals. Closed-loop operation of the FCC enabled flight dynamics and atmospheric disturbances affecting the aircraft to be represented during tests. Upset was induced in the FCC as a result of exposure to HIRF, and the effect of upset on the simulated flight of the aircraft was observed and recorded. This paper presents a description of these closed- loop HIRF experiments, upset data obtained from the FCC during these experiments, and closed-loop effects on the simulated flight of the aircraft.

Solar particle induced upsets in the TDRS-1 attitude control system RAM during the October 1989 solar particle events

NASA Astrophysics Data System (ADS)

Croley, D. R.; Garrett, H. B.; Murphy, G. B.; Garrard, T. L.

1995-10-01

The three large solar particle events, beginning on October 19, 1989 and lasting approximately six days, were characterized by high fluences of solar protons and heavy ions at 1 AU. During these events, an abnormally large number of upsets (243) were observed in the random access memory of the attitude control system (ACS) control processing electronics (CPE) on-board the geosynchronous TDRS-1 (Telemetry and Data Relay Satellite). The RAR I unit affected was composed of eight Fairchild 93L422 memory chips. The Galileo spacecraft, launched on October 18, 1989 (one day prior to the solar particle events) observed the fluxes of heavy ions experienced by TDRS-1. Two solid-state detector telescopes on-board Galileo designed to measure heavy ion species and energy, were turned on during time periods within each of the three separate events. The heavy ion data have been modeled and the time history of the events reconstructed to estimate heavy ion fluences. These fluences were converted to effective LET spectra after transport through the estimated shielding distribution around the TDRS-1 ACS system. The number of single event upsets (SEU) expected was calculated by integrating the measured cross section for the Fairchild 93L422 memory chip with average effective LET spectrum. The expected number of heavy ion induced SEUs calculated was 176. GOES-7 proton data, observed during the solar particle events, were used to estimate the number of proton-induced SEUs by integrating the proton fluence spectrum incident on the memory chips, with the two-parameter Bendel cross section for proton SEUs.

Using Cf-252 for single event upset testing

NASA Astrophysics Data System (ADS)

Howard, J. W.; Chen, R.; Block, R. C.; Becker, M.; Costantine, A. G.; Smith, L. S.; Soli, G. A.; Stauber, M. C.

An improved system using Cf-252 and associated nuclear instrumentation has been used to determine single event upset (SEU) cross section versus linear energy transfer (LET) curve for several static random access memory (SRAM) devices. Through the use of a thin-film scintillator, providing energy information on each fission fragment, individual SEU's and ion energy can be associated to calculate the cross section curves. Results are presented from tests of several SRAM's over the 17-43 MeV-cm squared/mg LET range. Values obtained for SEU cross sections and LET thresholds are in good agreement with the results from accelerator testing. The equipment is described, the theory of thin-film scintillation detector response is summarized, experimental procedures are reviewed, and the test results are discussed.

Single event upset vulnerability of selected 4K and 16K CMOS static RAM's

NASA Technical Reports Server (NTRS)

Kolasinski, W. A.; Koga, R.; Blake, J. B.; Brucker, G.; Pandya, P.; Petersen, E.; Price, W.

1982-01-01

Upset thresholds for bulk CMOS and CMOS/SOS RAMS were deduced after bombardment of the devices with 140 MeV Kr, 160 MeV Ar, and 33 MeV O beams in a cyclotron. The trials were performed to test prototype devices intended for space applications, to relate feature size to the critical upset charge, and to check the validity of computer simulation models. The tests were run on 4 and 1 K memory cells with 6 transistors, in either hardened or unhardened configurations. The upset cross sections were calculated to determine the critical charge for upset from the soft errors observed in the irradiated cells. Computer simulations of the critical charge were found to deviate from the experimentally observed variation of the critical charge as the square of the feature size. Modeled values of series resistors decoupling the inverter pairs of memory cells showed that above some minimum resistance value a small increase in resistance produces a large increase in the critical charge, which the experimental data showed to be of questionable validity unless the value is made dependent on the maximum allowed read-write time.

Current Radiation Issues for Programmable Elements and Devices

NASA Technical Reports Server (NTRS)

Katz, Richard; LaBel, K.; Reed, R.; Wang, J. J.; Cronquist, B.; McCollum, J.; Paolini, W.; Sin, B.; Koga, R.a; Crain, S.;

Airplane upset prevention research needs

DOT National Transportation Integrated Search

2008-08-18

This paper, which concludes the Upset Recovery Session convened and chaired by Dennis : Crider from the National Transportation Safety Board and the first author at the AIAA : Modeling and Simulation Technologies Conference 2008, provides a broad ove...

Proton Upset Monte Carlo Simulation

NASA Technical Reports Server (NTRS)

O'Neill, Patrick M.; Kouba, Coy K.; Foster, Charles C.

2009-01-01

The Proton Upset Monte Carlo Simulation (PROPSET) program calculates the frequency of on-orbit upsets in computer chips (for given orbits such as Low Earth Orbit, Lunar Orbit, and the like) from proton bombardment based on the results of heavy ion testing alone. The software simulates the bombardment of modern microelectronic components (computer chips) with high-energy (.200 MeV) protons. The nuclear interaction of the proton with the silicon of the chip is modeled and nuclear fragments from this interaction are tracked using Monte Carlo techniques to produce statistically accurate predictions.

Evaluation of a Wake Vortex Upset Model Based on Simultaneous Measurements of Wake Velocities and Probe-Aircraft Accelerations

NASA Technical Reports Server (NTRS)

Short, B. J.; Jacobsen, R. A.

1979-01-01

Simultaneous measurements were made of the upset responses experienced and the wake velocities encountered by an instrumented Learjet probe aircraft behind a Boeing 747 vortex-generating aircraft. The vortex-induced angular accelerations experienced could be predicted within 30% by a mathematical upset response model when the characteristics of the wake were well represented by the vortex model. The vortex model used in the present study adequately represented the wake flow field when the vortices dissipated symmetrically and only one vortex pair existed in the wake.

Physical Activity and Anger or Emotional Upset as Triggers of Acute Myocardial Infarction: The INTERHEART Study.

PubMed

Smyth, Andrew; O'Donnell, Martin; Lamelas, Pablo; Teo, Koon; Rangarajan, Sumathy; Yusuf, Salim

2016-10-11

Physical exertion, anger, and emotional upset are reported to trigger acute myocardial infarction (AMI). In the INTERHEART study, we explored the triggering association of acute physical activity and anger or emotional upset with AMI to quantify the importance of these potential triggers in a large, international population. INTERHEART was a case-control study of first AMI in 52 countries. In this analysis, we included only cases of AMI and used a case-crossover approach to estimate odds ratios for AMI occurring within 1 hour of triggers. Of 12 461 cases of AMI 13.6% (n=1650) engaged in physical activity and 14.4% (n=1752) were angry or emotionally upset in the case period (1 hour before symptom onset). Physical activity in the case period was associated with increased odds of AMI (odds ratio, 2.31; 99% confidence interval [CI], 1.96-2.72) with a population-attributable risk of 7.7% (99% CI, 6.3-8.8). Anger or emotional upset in the case period was associated with an increased odds of AMI (odds ratio, 2.44; 99% CI, 2.06-2.89) with a population-attributable risk of 8.5% (99% CI, 7.0-9.6). There was no effect modification by geographical region, prior cardiovascular disease, cardiovascular risk factor burden, cardiovascular prevention medications, or time of day or day of onset of AMI. Both physical activity and anger or emotional upset in the case period were associated with a further increase in the odds of AMI (odds ratio, 3.05; 99% CI, 2.29-4.07; P for interaction <0.001). Physical exertion and anger or emotional upset are triggers associated with first AMI in all regions of the world, in men and women, and in all age groups, with no significant effect modifiers. © 2016 American Heart Association, Inc.

Plutonium Immobilization Project System Design Description for Can Loading System

DOE Office of Scientific and Technical Information (OSTI.GOV)

Kriikku, E.

2001-02-15

The purpose of this System Design Description (SDD) is to specify the system and component functions and requirements for the Can Loading System and provide a complete description of the system (design features, boundaries, and interfaces), principles of operation (including upsets and recovery), and the system maintenance approach. The Plutonium Immobilization Project (PIP) will immobilize up to 13 metric tons (MT) of U.S. surplus weapons usable plutonium materials.

Effect of abortion protesters on women's emotional response to abortion.

PubMed

Foster, Diana Greene; Kimport, Katrina; Gould, Heather; Roberts, Sarah C M; Weitz, Tracy A

2013-01-01

Little is known about women's experiences with and reactions to protesters and how protesters affect women's emotional responses to abortion. We interviewed 956 women seeking abortion between 2008 and 2010 at 30 U.S. abortion care facilities and informants from 27 of these facilities. Most facilities reported a regular protester presence; one third identified protesters as aggressive towards patients. Nearly half (46%) of women interviewed saw protesters; of those, 25% reported being "a little" upset, and 16% reported being "quite a lot" or "extremely" upset. Women who had difficulty deciding to abort had higher odds of reporting being upset by protesters. In multivariable models, exposure to protesters was not associated with differences in emotions 1 week after the abortion. Protesters do upset some women seeking abortion services. However, exposure to protesters does not seem to have an effect on women's emotions about the abortion 1 week later. Copyright © 2013 Elsevier Inc. All rights reserved.

Offshore energy boom providing opportunities outside Medicare's umbrella.

PubMed

Robb, N

1998-09-08

Physicians upset by limits imposed by the medicare system are getting a chance to spread their entrepreneurial wings on the East Coast. A boom in offshore exploration, led by Newfoundland's massive Hibernia project, has led to numerous business opportunities for physicians.

Dynamic effect in ultrasonic assisted micro-upsetting

NASA Astrophysics Data System (ADS)

Presz, Wojciech

2018-05-01

The use of ultrasonic assistance in microforming is becoming more and more popular. Mainly due to the beneficial effect of vibrations on the flow of plastic deformation reported already in the 50s of the last century. The influence is of two types: surface and volume. The surface effect is mainly the reduction of friction forces, and volumetric is the impact on the dislocation movement and even on phase transitions. The work focuses on the dynamic aspect of vibration assisted microforming. The use of ultrasonic vibrations at a frequency of 20 kHz and an amplitude of 16 µm, in the micro-upsetting process of an aluminum sample resulted in a high concentration of strain on both ends of the sample - at 14% of the height on both sides. There was observed (in relation to deformations of the sample without vibrations) 150-250% increase and a 50% decrease in strain in the center of the sample. At the same time, the larger deformations occurred from the impact side of the punch. Analyzing the course of forces of the upsetting process in the loading and unloading phase as well as the process of breaking glass samples, the spring deflections of key system elements and their natural frequencies were determined or calculated. Based on the determined or calculated parameters of the test stand, it was shown that during the micro-upsetting process the punch may detach from the sample surface and this is the main reason for the phenomena occurring. Detach of the punch is also the cause of the observed instability of the measurement of force, which should be considered unbelievable in such a situation.

Development of methods for calculating basic features of the nuclear contribution to single event upsets under the effect of protons of moderately high energy

DOE Office of Scientific and Technical Information (OSTI.GOV)

Chechenin, N. G., E-mail: chechenin@sinp.msu.ru; Chuvilskaya, T. V.; Shirokova, A. A.

2015-10-15

As a continuation and a development of previous studies of our group that were devoted to the investigation of nuclear reactions induced by protons of moderately high energy (between 10 and 400 MeV) in silicon, aluminum, and tungsten atoms, the results obtained by exploring nuclear reactions on atoms of copper, which is among the most important components in materials for contact pads and pathways in modern and future ultralarge-scale integration circuits, especially in three-dimensional topology, are reported in the present article. The nuclear reactions in question lead to the formation of the mass and charge spectra of recoil nuclei rangingmore » fromheavy target nuclei down to helium and hydrogen. The kineticenergy spectra of reaction products are calculated. The results of the calculations based on the procedure developed by our group are compared with the results of calculations and experiments performed by other authors.« less

Trends In Susceptibility To Single-Event Upset

NASA Technical Reports Server (NTRS)

Nichols, Donald K.; Price, William E.; Kolasinski, Wojciech A.; Koga, Rukotaro; Waskiewicz, Alvin E.; Pickel, James C.; Blandford, James T.

1989-01-01

Report provides nearly comprehensive body of data on single-event upsets due to irradiation by heavy ions. Combines new test data and previously published data from governmental and industrial laboratories. Clear trends emerge from data useful in predicting future performances of devices.

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

NASA Technical Reports Server (NTRS)

Pellish, Jonathan A.; Marshall, Paul W.; Rodbell, Kenneth P.; Gordon, Michael S.; LaBel, Kenneth A.; Schwank, James R.; Dodds, Nathaniel A.; Castaneda, Carlos M.; Berg, Melanie D.; Kim, Hak S.;

A new method for using Cf-252 in SEU testing

NASA Astrophysics Data System (ADS)

Costantine, A.; Howard, J. W.; Becker, M.; Block, R. C.; Smith, L. S.; Soli, G. A.; Stauber, M. C.

1990-12-01

A system using Cf-252 and associated nuclear instrumentation has determined the single-event upset (SEU) cross section versus linear energy transfer (LET) curve for several 2K x 8 static random access memories (SRAMs). The Cf-252 fission fragments pass through a thin-film organic scintillator detector (TFD) on the way to the device under test (DUT). The TFD provides energy information for each transiting fragment. Data analysis provides the energy of the individual ion responsible for each SEU; thus, separate upset cross sections can be developed for different energy and mass regions of the californium spectrum. This californium-based device is quite small and fits onto a bench top. It provides a convenient and inexpensive supplement or alternative to accelerator and high-altitude/space SEU testing.

The Dangers of Failure Masking in Fault-Tolerant Software: Aspects of a Recent In-Flight Upset Event

NASA Technical Reports Server (NTRS)

Johnson, C. W.; Holloway, C. M.

2007-01-01

On 1 August 2005, a Boeing Company 777-200 aircraft, operating on an international passenger flight from Australia to Malaysia, was involved in a significant upset event while flying on autopilot. The Australian Transport Safety Bureau's investigation into the event discovered that an anomaly existed in the component software hierarchy that allowed inputs from a known faulty accelerometer to be processed by the air data inertial reference unit (ADIRU) and used by the primary flight computer, autopilot and other aircraft systems. This anomaly had existed in original ADIRU software, and had not been detected in the testing and certification process for the unit. This paper describes the software aspects of the incident in detail, and suggests possible implications concerning complex, safety-critical, fault-tolerant software.

Annual Conference on Nuclear and Space Radiation Effects, Gatlinburg, TN, July 18-21, 1983, Proceedings

NASA Technical Reports Server (NTRS)

1983-01-01

Topics discussed include radiation effects in devices; the basic mechanisms of radiation effects in structures and materials; radiation effects in integrated circuits; spacecraft charging and space radiation effects; hardness assurance for devices and systems; and radiation transport, energy deposition and charge collection. Papers are presented on the mechanisms of small instabilities in irradiated MOS transistors, on the radiation effects on oxynitride gate dielectrics, on the discharge characteristics of a simulated solar cell array, and on latchup in CMOS devices from heavy ions. Attention is also given to proton upsets in orbit, to the modeling of single-event upset in bipolar integrated circuits, to high-resolution studies of the electrical breakdown of soil, and to a finite-difference solution of Maxwell's equations in generalized nonorthogonal coordinates.

A new method for using Cf-252 in SEU testing

NASA Technical Reports Server (NTRS)

Costantine, A.; Howard, J. W.; Becker, M.; Block, R. C.; Smith, L. S.; Soli, G. A.; Stauber, M. C.

1990-01-01

A system using Cf-252 and associated nuclear instrumentation has determined the single-event upset (SEU) cross section versus linear energy transfer (LET) curve for several 2K x 8 static random access memories (SRAMs). The Cf-252 fission fragments pass through a thin-film organic scintillator detector (TFD) on the way to the device under test (DUT). The TFD provides energy information for each transiting fragment. Data analysis provides the energy of the individual ion responsible for each SEU; thus, separate upset cross sections can be developed for different energy and mass regions of the californium spectrum. This californium-based device is quite small and fits onto a bench top. It provides a convenient and inexpensive supplement or alternative to accelerator and high-altitude/space SEU testing.

Offshore energy boom providing opportunities outside medicare's umbrella

PubMed Central

Robb, N

1998-01-01

Physicians upset by limits imposed by the medicare system are getting a chance to spread their entrepreneurial wings on the East Coast. A boom in offshore exploration, led by Newfoundland's massive Hibernia project, has led to numerous business opportunities for physicians. PMID:9757185

Mitigating Upsets in SRAM Based FPGAs from the Xilinix Virtex 2 Family

NASA Technical Reports Server (NTRS)

Swift, Gary M.; Yui, Candice C.; Carmichael, Carl; Koga, Rocky; George, Jeffrey S.

2003-01-01

This slide presentation reviews the single event upset static testing of the Virtex II field programmable gate arrays (FPGA) that were tested in protons and heavy-ions. The test designs and static and dynamic test results are reviewed.

Chronic Stress is Prospectively Associated with Sleep in Midlife Women: The SWAN Sleep Study

PubMed Central

Hall, Martica H.; Casement, Melynda D.; Troxel, Wendy M.; Matthews, Karen A.; Bromberger, Joyce T.; Kravitz, Howard M.; Krafty, Robert T.; Buysse, Daniel J.

2015-01-01

Study Objectives: Evaluate whether levels of upsetting life events measured over a 9-y period prospectively predict subjective and objective sleep outcomes in midlife women. Design: Prospective cohort study. Setting: Four sites across the United States. Participants: 330 women (46–57 y of age) enrolled in the Study of Women's Health Across the Nation (SWAN) Sleep Study. Interventions: N/A. Measurements and Results: Upsetting life events were assessed annually for up to 9 y. Trajectory analysis applied to life events data quantitatively identified three distinct chronic stress groups: low stress, moderate stress, and high stress. Sleep was assessed by self-report and in-home polysomnography (PSG) during the ninth year of the study. Multivariate analyses tested the prospective association between chronic stress group and sleep, adjusting for race, baseline sleep complaints, marital status, body mass index, symptoms of depression, and acute life events at the time of the Sleep Study. Women characterized by high chronic stress had lower subjective sleep quality, were more likely to report insomnia, and exhibited increased PSG-assessed wake after sleep onset (WASO) relative to women with low to moderate chronic stress profiles. The effect of chronic stress group on WASO persisted in the subsample of participants without baseline sleep complaints. Conclusions: Chronic stress is prospectively associated with sleep disturbance in midlife women, even after adjusting for acute stressors at the time of the sleep study and other factors known to disrupt sleep. These results are consistent with current models of stress that emphasize the cumulative effect of stressors on health over time. Citation: Hall MH, Casement MD, Troxel WM, Matthews KA, Bromberger JT, Kravitz HM, Krafty RT, Buysse DJ. Chronic stress is prospectively associated with sleep in midlife women: the SWAN Sleep Study. SLEEP 2015;38(10):1645–1654. PMID:26039965

Closed-Loop Evaluation of an Integrated Failure Identification and Fault Tolerant Control System for a Transport Aircraft

NASA Technical Reports Server (NTRS)

Shin, Jong-Yeob; Belcastro, Christine; Khong, thuan

2006-01-01

Formal robustness analysis of aircraft control upset prevention and recovery systems could play an important role in their validation and ultimate certification. Such systems developed for failure detection, identification, and reconfiguration, as well as upset recovery, need to be evaluated over broad regions of the flight envelope or under extreme flight conditions, and should include various sources of uncertainty. To apply formal robustness analysis, formulation of linear fractional transformation (LFT) models of complex parameter-dependent systems is required, which represent system uncertainty due to parameter uncertainty and actuator faults. This paper describes a detailed LFT model formulation procedure from the nonlinear model of a transport aircraft by using a preliminary LFT modeling software tool developed at the NASA Langley Research Center, which utilizes a matrix-based computational approach. The closed-loop system is evaluated over the entire flight envelope based on the generated LFT model which can cover nonlinear dynamics. The robustness analysis results of the closed-loop fault tolerant control system of a transport aircraft are presented. A reliable flight envelope (safe flight regime) is also calculated from the robust performance analysis results, over which the closed-loop system can achieve the desired performance of command tracking and failure detection.

Empirical Modeling Of Single-Event Upset

NASA Technical Reports Server (NTRS)

Zoutendyk, John A.; Smith, Lawrence S.; Soli, George A.; Thieberger, Peter; Smith, Stephen L.; Atwood, Gregory E.

1988-01-01

Experimental study presents examples of empirical modeling of single-event upset in negatively-doped-source/drain metal-oxide-semiconductor static random-access memory cells. Data supports adoption of simplified worst-case model in which cross sectionof SEU by ion above threshold energy equals area of memory cell.

High-Energy Electron-Induced SEUs and Jovian Environment Impact

NASA Astrophysics Data System (ADS)

Tali, Maris; Alía, Rubén García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Farabolini, Wilfrid; Mohammadzadeh, Ali; Santin, Giovanni; Virtanen, Ari

2017-08-01

We present experimental evidence of electron-induced upsets in a reference European Space Agency (ESA) single event upset (SEU) monitor, induced by a 200-MeV electron beam at the Very energetic Electronic facility for Space Planetary Exploration in harsh Radiation environments facility at CERN. Comparison of experimental cross sections and simulated cross sections is shown and the differences are analyzed. Possible secondary contributions to the upset rate by neutrons, flash effects, and cumulative dose effects are discussed, showing that electronuclear reactions are the expected SEU mechanism. The ESA Jupiter Icy Moons Explorer mission, to be launched in 2022, presents a challenging radiation environment due to the intense high-energy electron flux in the trapped radiation belts. Insight is given to the possible contribution of electrons to the overall upset rates in the Jovian radiation environment. Relative contributions of both typical electron and proton spectra created when the environmental spectra are transported through a typical spacecraft shielding are shown and the different mission phases are discussed.

A monitor for the laboratory evaluation of control integrity in digital control systems operating in harsh electromagnetic environments

NASA Technical Reports Server (NTRS)

Belcastro, Celeste M.; Fischl, Robert; Kam, Moshe

1992-01-01

This paper presents a strategy for dynamically monitoring digital controllers in the laboratory for susceptibility to electromagnetic disturbances that compromise control integrity. The integrity of digital control systems operating in harsh electromagnetic environments can be compromised by upsets caused by induced transient electrical signals. Digital system upset is a functional error mode that involves no component damage, can occur simultaneously in all channels of a redundant control computer, and is software dependent. The motivation for this work is the need to develop tools and techniques that can be used in the laboratory to validate and/or certify critical aircraft controllers operating in electromagnetically adverse environments that result from lightning, high-intensity radiated fields (HIRF), and nuclear electromagnetic pulses (NEMP). The detection strategy presented in this paper provides dynamic monitoring of a given control computer for degraded functional integrity resulting from redundancy management errors, control calculation errors, and control correctness/effectiveness errors. In particular, this paper discusses the use of Kalman filtering, data fusion, and statistical decision theory in monitoring a given digital controller for control calculation errors.

Shortcomings in ground testing, environment simulations, and performance predictions for space applications

NASA Technical Reports Server (NTRS)

Stassinopoulos, E. G.; Brucker, G. J.

1992-01-01

This paper addresses the issues involved in radiation testing of devices and subsystems to obtain the data that are required to predict the performance and survivability of satellite systems for extended missions in space. The problems associated with space environmental simulations, or the lack thereof, in experiments intended to produce information to describe the degradation and behavior of parts and systems are discussed. Several types of radiation effects in semiconductor components are presented, as for example: ionization dose effects, heavy ion and proton induced Single Event Upsets (SEUs), and Single Event Transient Upsets (SETUs). Examples and illustrations of data relating to these ground testing issues are provided. The primary objective of this presentation is to alert the reader to the shortcomings, pitfalls, variabilities, and uncertainties in acquiring information to logically design electronic subsystems for use in satellites or space stations with long mission lifetimes, and to point out the weaknesses and deficiencies in the methods and procedures by which that information is obtained.

Piloted Simulation to Evaluate the Utility of a Real Time Envelope Protection System for Mitigating In-Flight Icing Hazards

NASA Technical Reports Server (NTRS)

Ranaudo, Richard J.; Martos, Borja; Norton, Bill W.; Gingras, David R.; Barnhart, Billy P.; Ratvasky, Thomas P.; Morelli, Eugene

2011-01-01

The utility of the Icing Contamination Envelope Protection (ICEPro) system for mitigating a potentially hazardous icing condition was evaluated by 29 pilots using the NASA Ice Contamination Effects Flight Training Device (ICEFTD). ICEPro provides real time envelope protection cues and alerting messages on pilot displays. The pilots participating in this test were divided into two groups; a control group using baseline displays without ICEPro, and an experimental group using ICEPro driven display cueing. Each group flew identical precision approach and missed approach procedures with a simulated failure case icing condition. Pilot performance, workload, and survey questionnaires were collected for both groups of pilots. Results showed that real time assessment cues were effective in reducing the number of potentially hazardous upset events and in lessening exposure to loss of control following an incipient upset condition. Pilot workload with the added ICEPro displays was not measurably affected, but pilot opinion surveys showed that real time cueing greatly improved their situation awareness of a hazardous aircraft state.

Showdown or Slow Down? When Someone Upsets You

Cancer.gov

Sometimes, the people you are closest to might say and do things that hurt, anger, or just rub you the wrong way. If someone upsets you, it can be tricky to figure out when and how to talk to them about it, without making things worse.

Sex Differences in the Socialization of Competence in Preschoolers.

ERIC Educational Resources Information Center

Roberts, William L.

An extension of a project that examined the associations between parental responses to children's emotional upset and children's competence in preschool, this study focuses on gender differences in the socialization of competence. Parents' warmth and responsiveness, firmness and control, and responses to their children's emotional upset were…

New Mode For Single-Event Upsets

NASA Technical Reports Server (NTRS)

Zoutendyk, John A.; Smith, Lawrence S.; Soli, George A.; Lo, Roger Y.

1988-01-01

Report presents theory and experimental data regarding newly discovered mode for single-event upsets, (SEU's) in complementary metal-oxide/semiconductor, static random-access memories, CMOS SRAM's. SEU cross sections larger than those expected from previously known modes given rise to speculation regarding additional mode, and subsequent cross-section measurements appear to confirm speculation.

Annual Conference on Nuclear and Space Radiation Effects, 17th, Cornell University, Ithaca, N.Y., July 15-18, 1980, Proceedings

NASA Technical Reports Server (NTRS)

Mcgarrity, J. M.

1980-01-01

The conference covered the radiation effects on devices, circuits, and systems, physics and basic radiation effects in materials, dosimetry and radiation transport, spacecraft charging, and space radiation effects. Other subjects included single particle upset phenomena, systems-generated electromagnetic pulse phenomena, fabrication of hardened components, testing techniques, and hardness assurance.

The single event upset environment for avionics at high latitude

DOE Office of Scientific and Technical Information (OSTI.GOV)

Sims, A.J.; Dyer, C.S.; Peerless, C.L.

1994-12-01

Modern avionic systems for civil and military applications are becoming increasingly reliant upon embedded microprocessors and associated memory devices. The phenomenon of single event upset (SEU) is well known in space systems and designers have generally been careful to use SEU tolerant devices or to implement error detection and correction (EDAC) techniques where appropriate. In the past, avionics designers have had no reason to consider SEU effects but is clear that the more prevalent use of memory devices combined with increasing levels of IC integration will make SEU mitigation an important design consideration for future avionic systems. To this end,more » it is necessary to work towards producing models of the avionics SEU environment which will permit system designers to choose components and EDAC techniques which are based on predictions of SEU rates correct to much better than an order of magnitude. Measurements of the high latitude SEU environment at avionics altitude have been made on board a commercial airliner. Results are compared with models of primary and secondary cosmic rays and atmospheric neutrons. Ground based SEU tests of static RAMs are used to predict rates in flight.« less

DOE Office of Scientific and Technical Information (OSTI.GOV)

Tanaka, T.J.; Antonescu, C.

A program to assess the impact of smoke on digital instrumentation and control (I and C) safety systems began in 1994, funded by the US Nuclear Regulatory Commission Office of Research. Digital I and C safety systems are likely replacements for today`s analog systems. The nuclear industry has little experience in qualifying digital electronics for critical systems, part of which is understanding system performance during plant fires. The results of tests evaluating the performance of digital circuits and chip technologies exposed to the various smoke and humidity conditions representative of cable fires are discussed. Tests results show that low tomore » moderate smoke densities can cause intermittent failures of digital systems. Smoke increases leakage currents between biased contacts, leading to shorts. Chips with faster switching times, and thus higher output drive currents, are less sensitive to leakage currents and thus to smoke. Contact corrosion from acidic gases in smoke and inductance of stray capacitance are less important contributors to system upset. Transmission line coupling was increased because the smoke acted as a conductive layer between the lines. Permanent circuit damage was not obvious in the 24 hr of circuit monitoring. Test results also show that polyurethane, parylene, and acrylic conformal coatings are more effective in protecting against smoke than epoxy or silicone. Common-sense mitigation measures are discussed. Unfortunately the authors are a long way from standard tests for smoke exposure that capture the variations in smoke exposure possible in an actual fire.« less

Static Computer Memory Integrity Testing (SCMIT): An experiment flown on STS-40 as part of GAS payload G-616

NASA Technical Reports Server (NTRS)

Hancock, Thomas

1993-01-01

This experiment investigated the integrity of static computer memory (floppy disk media) when exposed to the environment of low earth orbit. The experiment attempted to record soft-event upsets (bit-flips) in static computer memory. Typical conditions that exist in low earth orbit that may cause soft-event upsets include: cosmic rays, low level background radiation, charged fields, static charges, and the earth's magnetic field. Over the years several spacecraft have been affected by soft-event upsets (bit-flips), and these events have caused a loss of data or affected spacecraft guidance and control. This paper describes a commercial spin-off that is being developed from the experiment.

Global Aerodynamic Modeling for Stall/Upset Recovery Training Using Efficient Piloted Flight Test Techniques

NASA Technical Reports Server (NTRS)

Morelli, Eugene A.; Cunningham, Kevin; Hill, Melissa A.

2013-01-01

Flight test and modeling techniques were developed for efficiently identifying global aerodynamic models that can be used to accurately simulate stall, upset, and recovery on large transport airplanes. The techniques were developed and validated in a high-fidelity fixed-base flight simulator using a wind-tunnel aerodynamic database, realistic sensor characteristics, and a realistic flight deck representative of a large transport aircraft. Results demonstrated that aerodynamic models for stall, upset, and recovery can be identified rapidly and accurately using relatively simple piloted flight test maneuvers. Stall maneuver predictions and comparisons of identified aerodynamic models with data from the underlying simulation aerodynamic database were used to validate the techniques.

Communications Satellites: A New Channel for International Communications, A New Source of International Tension.

ERIC Educational Resources Information Center

Mickelson, Sig

Communications satellites could be the subject of bitter and potentially dangerous international controversy. They threaten to upset the comfortable monopoly of internal national communications systems which have enrolled national governments to screen intrusions of unwanted information or ideas. The United Nations Working Committee on Direct…

FPGAs in Space Environment and Design Techniques

NASA Technical Reports Server (NTRS)

Katz, Richard B.; Day, John H. (Technical Monitor)

2001-01-01

This viewgraph presentation gives an overview of Field Programmable Gate Arrays (FPGA) in the space environment and design techniques. Details are given on the effects of the space radiation environment, total radiation dose, single event upset, single event latchup, single event transient, antifuse technology and gate rupture, proton upsets and sensitivity, and loss of functionality.

Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM

NASA Technical Reports Server (NTRS)

Chen, Dakai; Wilcox, Edward; Berg, Melanie; Kim, Hak; Phan, Anthony; Figueiredo, Marco; Seidleck, Christina; LaBel, Kenneth

2015-01-01

We investigated the heavy ion single-event effect (SEE) susceptibility of the industry’s first stand-alone memory based on conductive-bridge memory (CBRAM) technology. The device is available as an electrically erasable programmable read-only memory (EEPROM). We found that single-event functional interrupt (SEFI) is the dominant SEE type for each operational mode (standby, dynamic read, and dynamic write/read). SEFIs occurred even while the device is statically biased in standby mode. Worst case SEFIs resulted in errors that filled the entire memory space. Power cycle did not always clear the errors. Thus the corrupted cells had to be reprogrammed in some cases. The device is also vulnerable to bit upsets during dynamic write/read tests, although the frequency of the upsets are relatively low. The linear energy transfer threshold for cell upset is between 10 and 20 megaelectron volts per square centimeter per milligram, with an upper limit cross section of 1.6 times 10(sup -11) square centimeters per bit (95 percent confidence level) at 10 megaelectronvolts per square centimeter per milligram. In standby mode, the CBRAM array appears invulnerable to bit upsets.

UpSet: Visualization of Intersecting Sets

PubMed Central

Lex, Alexander; Gehlenborg, Nils; Strobelt, Hendrik; Vuillemot, Romain; Pfister, Hanspeter

2016-01-01

Understanding relationships between sets is an important analysis task that has received widespread attention in the visualization community. The major challenge in this context is the combinatorial explosion of the number of set intersections if the number of sets exceeds a trivial threshold. In this paper we introduce UpSet, a novel visualization technique for the quantitative analysis of sets, their intersections, and aggregates of intersections. UpSet is focused on creating task-driven aggregates, communicating the size and properties of aggregates and intersections, and a duality between the visualization of the elements in a dataset and their set membership. UpSet visualizes set intersections in a matrix layout and introduces aggregates based on groupings and queries. The matrix layout enables the effective representation of associated data, such as the number of elements in the aggregates and intersections, as well as additional summary statistics derived from subset or element attributes. Sorting according to various measures enables a task-driven analysis of relevant intersections and aggregates. The elements represented in the sets and their associated attributes are visualized in a separate view. Queries based on containment in specific intersections, aggregates or driven by attribute filters are propagated between both views. We also introduce several advanced visual encodings and interaction methods to overcome the problems of varying scales and to address scalability. UpSet is web-based and open source. We demonstrate its general utility in multiple use cases from various domains. PMID:26356912

RH1020 Single Event Clock Upset Summary Report

NASA Technical Reports Server (NTRS)

Katz, Richard B.; Wang, J. J.

1998-01-01

This report summarizes the testing and analysis of "single event clock upset' in the RH1020. Also included are SEU-rate predictions and design recommendations for risk analysis and reduction. The subject of "upsets" in the RH1020 is best understood by using a model consisting of a global clock buffer and a D-type flip-flop as the basic memory unit. The RH1020 is built on the ACT 1 family architecture. As such, it has one low-skew global clock buffer with a TTL-level input threshold that is accessed via a single dedicated pin. The clock signal is driven to full CMOS levels, buffered, and sent to individual row buffers with one buffer per channel. For low-skew performance, the outputs of all of the RH1020 row buffers are shorted together via metal lines, as is done in the A1020B. All storage in the RH1020 consists of routed flip-flops, constructed with multiplexors and feedback through the routing segments. A simple latch can be constructed from a single (combinatorial or C) module; an edge-triggered flip-flop is constructed using two concatenated latches. There is no storage in the I/O modules. The front end of the clock buffering circuitry, at a common point relative to the row buffer, is a sub-circuit that was determined to be the most susceptible to heavy ions. This is due, in part, to its smaller transistors compared to the rest of the circuitry. This conclusion is also supported by SPICE simulations and an analysis of the heavy ion data, described in this report. The edge triggered D flip-flop has two single-event-upset modes. Mode one, called C-module upset, is caused by a heavy ion striking the C-module's sensitive area on the silicon and produces a soft single bit error at the output of the flip-flop. Mode two, called clock upset, is caused by a heavy ion strike on the clock buffer, generating a runt pulse interpreted as a false clock signal and consequently producing errors at the flip-flop outputs. C-module upset sensitivity in the RH1020 is essentially the same as that of its ACT 1 siblings (A1020, A1020A and A1020B), which were well tested, analyzed, and documented in the literature.

Development, Implementation, and Pilot Evaluation of a Model-Driven Envelope Protection System to Mitigate the Hazard of In-Flight Ice Contamination on a Twin-Engine Commuter Aircraft

NASA Technical Reports Server (NTRS)

Martos, Borja; Ranaudo, Richard; Norton, Billy; Gingras, David; Barnhart, Billy

2014-01-01

Fatal loss-of-control accidents have been directly related to in-flight airframe icing. The prototype system presented in this report directly addresses the need for real-time onboard envelope protection in icing conditions. The combination of prior information and real-time aerodynamic parameter estimations are shown to provide sufficient information for determining safe limits of the flight envelope during inflight icing encounters. The Icing Contamination Envelope Protection (ICEPro) system was designed and implemented to identify degradations in airplane performance and flying qualities resulting from ice contamination and provide safe flight-envelope cues to the pilot. The utility of the ICEPro system for mitigating a potentially hazardous icing condition was evaluated by 29 pilots using the NASA Ice Contamination Effects Flight Training Device. Results showed that real time assessment cues were effective in reducing the number of potentially hazardous upset events and in lessening exposure to loss of control following an incipient upset condition. Pilot workload with the added ICEPro displays was not measurably affected, but pilot opinion surveys showed that real time cueing greatly improved their awareness of a hazardous aircraft state. The performance of ICEPro system was further evaluated by various levels of sensor noise and atmospheric turbulence.

An investigation of the direct-drive method of susceptibility testing

DOE Office of Scientific and Technical Information (OSTI.GOV)

Bonn, R.H.

1992-07-01

The Naval Surface Weapons Laboratory has constructed a small electrical subsystem for the purpose of evaluating electrical upset from various electromagnetic sources. The subsystem consists of three boxes, two of which are intended to be illuminated by electromagnetic waves. The two illuminated boxes are connected by two unshielded cable bundles. The goal of the Navy test series is to expose the subsystem to electromagnetic illumination from several different types of excitation, document upset levels, and compare the results. Before its arrival at Sandia National Laboratories (SNL) the system was illuminated in a mode stirred chamber and in an anechoic chamber.more » This effort was a continuation of that test program. The Sandia tests involved the test methodology referred to as bulk current injection (BCI). Because this is a poorly-shielded, multiple-aperture system, the method was not expected to compare closely to the other test methods. The test results show that. The BCI test methodology is a useful test technique for a subset of limited aperture systems; the methodology will produce incorrect answers when used improperly on complex systems; the methodology can produce accurate answers on simple systems with a well-controlled electromagnetic topology. This is a preliminary study and the results should be interpreted carefully.« less

Effects of dietary changes and yeast culture (Saccharomyces cerevisiae) on rumen microbial fermentation of Holstein heifers.

PubMed

Moya, D; Calsamiglia, S; Ferret, A; Blanch, M; Fandiño, J I; Castillejos, L; Yoon, I

2009-09-01

The effects of a dietary challenge to induce digestive upsets and supplementation with yeast culture on rumen microbial fermentation were studied using 12 Holstein heifers (277 +/- 28 kg of BW) fitted with a ruminal cannula, in a crossover design with 2 periods of 5 wk. In each period, after 3 wk of adaptation to a 100% forage diet, the dietary challenge consisted of increasing the amount of grain at a rate of 2.5 kg/d (as-fed basis) over a period of 4 d, until a 10:90 forage:concentrate diet was reached, and then it was maintained for 10 d. Between periods, animals were fed again the 100% forage diet without any treatment for 1 wk as a wash-out period. Treatments started the first day of each period, and they were a control diet (CL) or the same diet with addition of yeast culture (YC, Diamond V XPCLS). Digestive upsets were determined by visual observation of bloat or by a reduction in feed intake (as-fed basis) of 50% or more compared with intake on the previous day. Feed intake was determined daily at 24-h intervals during the adaptation period and daily at 2, 6, and 12 h postfeeding during the dietary challenge. Ruminal liquid samples were collected daily during the dietary challenge to determine ruminal pH at 0, 3, 6, and 12 h postfeeding, and total and individual VFA, lactic acid, ammonia-N, and rumen fluid viscosity at 0 and 6 h postfeeding. The 16s rRNA gene copies of Streptococcus bovis and Megasphaera elsdenii were determined by quantitative PCR. Foam height and strength of the rumen fluid were also determined the day after the digestive upset to evaluate potential foam production. A total of 20 cases (83.3%) of digestive upsets were recorded in both periods during the dietary challenge, all diagnosed due to a reduction in feed intake. Rumen fermentation profile at 0 h on the digestive upset day was characterized by low ruminal pH, which remained under 6.0 for 18 h, accompanied by elevated total VFA concentration and, in some cases, by elevated lactate concentration. Addition of YC during the dietary challenge did not affect the incidence (10 cases per treatment) or time (7.00 +/- 0.62 d) to digestive upset. However, YC reduced (P < 0.05) the foam strength on the day after digestive upset, suggesting potential benefits of reducing the risk of developing bloat. The proposed dietary challenge model was successful in causing a digestive upset as indicated by reduced feed intake, but the YC addition had no significant impact on rumen fermentation.

Computing in the presence of soft bit errors. [caused by single event upset on spacecraft

NASA Technical Reports Server (NTRS)

Rasmussen, R. D.

1984-01-01

It is shown that single-event-upsets (SEUs) due to cosmic rays are a significant source of single bit error in spacecraft computers. The physical mechanism of SEU, electron hole generation by means of Linear Energy Transfer (LET), it discussed with reference made to the results of a study of the environmental effects on computer systems of the Galileo spacecraft. Techniques for making software more tolerant of cosmic ray effects are considered, including: reducing the number of registers used by the software; continuity testing of variables; redundant execution of major procedures for error detection; and encoding state variables to detect single-bit changes. Attention is also given to design modifications which may reduce the cosmic ray exposure of on-board hardware. These modifications include: shielding components operating in LEO; removing low-power Schottky parts; and the use of CMOS diodes. The SEU parameters of different electronic components are listed in a table.

Single Event Upset Analysis: On-orbit performance of the Alpha Magnetic Spectrometer Digital Signal Processor Memory aboard the International Space Station

NASA Astrophysics Data System (ADS)

Li, Jiaqiang; Choutko, Vitaly; Xiao, Liyi

2018-03-01

Based on the collection of error data from the Alpha Magnetic Spectrometer (AMS) Digital Signal Processors (DSP), on-orbit Single Event Upsets (SEUs) of the DSP program memory are analyzed. The daily error distribution and time intervals between errors are calculated to evaluate the reliability of the system. The particle density distribution of International Space Station (ISS) orbit is presented and the effects from the South Atlantic Anomaly (SAA) and the geomagnetic poles are analyzed. The impact of solar events on the DSP program memory is carried out combining data analysis and Monte Carlo simulation (MC). From the analysis and simulation results, it is concluded that the area corresponding to the SAA is the main source of errors on the ISS orbit. Solar events can also cause errors on DSP program memory, but the effect depends on the on-orbit particle density.

Single-Word Multiple-Bit Upsets in Static Random Access Devices

DTIC Science & Technology

1998-01-15

Transactions on Nuclear Science, NS-33, 1616- 1619,1986. Criswell, T.L., P.R. Measel , and K.L. Walin, "Single Event Upset Testing with Relativistic...Heavy Ions," IEEE Transactions on Nuclear Science, NS-31, 1559- 1561,1984. 1946 3. Criswell, T.L., D.L. Oberg, J.L. Wert, P.R. Measel , and W.E

Heavy Ion and Proton Tests for Subsystem Upset.

DTIC Science & Technology

1988-03-21

R. Kennerud, P. Measel , and K. Wahlin, "Transient And Total Dose Radiation Properties Of The CMOS/SOS EPIC Chip Set", IEEE Trans. on Nucl. Sci., Vol...NS-30, No. 6, Dec. 1983 .(3) T. L. Criswell, P. R. Measel , and K. L. Wahlin, "Single Event Upset P Testing With Relativistic Heavy Ions", IEEE Trans

Across Six Nations: Stressful Events in the Lives of Children.

ERIC Educational Resources Information Center

Yamamoto, Kaoru; And Others

1996-01-01

A study asked 1,729 children and adolescents (second to ninth grades) in South Africa, Iceland, Poland, Australia, the United Kingdom, and the United States to rate the unpleasantness of 20 stressful life events. Results indicated that the loss of a parent was most upsetting and a new sibling was least upsetting for subjects in all countries…

Radiation effects on active camera electronics in the target chamber at the National Ignition Facility

NASA Astrophysics Data System (ADS)

Dayton, M.; Datte, P.; Carpenter, A.; Eckart, M.; Manuel, A.; Khater, H.; Hargrove, D.; Bell, P.

2017-08-01

The National Ignition Facility's (NIF) harsh radiation environment can cause electronics to malfunction during high-yield DT shots. Until now there has been little experience fielding electronic-based cameras in the target chamber under these conditions; hence, the performance of electronic components in NIF's radiation environment was unknown. It is possible to purchase radiation tolerant devices, however, they are usually qualified for radiation environments different to NIF, such as space flight or nuclear reactors. This paper presents the results from a series of online experiments that used two different prototype camera systems built from non-radiation hardened components and one commercially available camera that permanently failed at relatively low total integrated dose. The custom design built in Livermore endured a 5 × 1015 neutron shot without upset, while the other custom design upset at 2 × 1014 neutrons. These results agreed with offline testing done with a flash x-ray source and a 14 MeV neutron source, which suggested a methodology for developing and qualifying electronic systems for NIF. Further work will likely lead to the use of embedded electronic systems in the target chamber during high-yield shots.

Reliability of system for precise cold forging

NASA Astrophysics Data System (ADS)

Krušič, Vid; Rodič, Tomaž

2017-07-01

The influence of scatter of principal input parameters of the forging system on the dimensional accuracy of product and on the tool life for closed-die forging process is presented in this paper. Scatter of the essential input parameters for the closed-die upsetting process was adjusted to the maximal values that enabled the reliable production of a dimensionally accurate product at optimal tool life. An operating window was created in which exists the maximal scatter of principal input parameters for the closed-die upsetting process that still ensures the desired dimensional accuracy of the product and the optimal tool life. Application of the adjustment of the process input parameters is shown on the example of making an inner race of homokinetic joint from mass production. High productivity in manufacture of elements by cold massive extrusion is often achieved by multiple forming operations that are performed simultaneously on the same press. By redesigning the time sequences of forming operations at multistage forming process of starter barrel during the working stroke the course of the resultant force is optimized.

Teething troubles?

PubMed

McIntyre, G T; McIntyre, G M

2002-03-09

The relationship between the eruption of the deciduous teeth and the general health of infants has been documented for over 5,000 years. A variety of physical disturbances (anything from minor upsets to potentially fatal illnesses) have historically been attributed to teething, however a number of recent publications have alluded to a clarification of some of the disputed features of teething. It is now accepted that the localised symptoms of teething vary between individuals, however, 'teething' continues to be an inappropriate diagnosis proffered by both healthcare professionals and lay people. Severe systemic upsets are unrelated to teething and, if present, the infant should be promptly referred to a physician for an accurate diagnosis and appropriate treatment. The treatment modalities used in teething have been diverse throughout the ages, frequently depending on the tenets of the medical profession and lay people, but now principally involve pain relief. This article examines the signs and symptoms frequently attributed to teething and their possible alternative causes. The contemporary principles of the management of teething are discussed, including supportive measures, the diverse range of available topical and systemic pharmacological preparations and the 'alternative' holistic therapies.

Linking hearts and minds in couple interactions: intentions, attributions, and overriding sentiments.

PubMed

Waldinger, Robert J; Schulz, Marc S

2006-09-01

This study examined the role of emotion and relationship satisfaction in shaping attributions about a partner's intentions in couple interactions. Using video recall, participants (N = 156 couples) reported on their own and their partner's intentions and emotions during affective moments of a discussion about an upsetting event. Links were found between relationship satisfaction and factor-analytically derived intention and attribution scales. Attributions about a partner's intentions were weakly to moderately correlated with the partner's self-reported intentions. Relationship satisfaction accounted for part of the discrepancy between self-reported intentions and partner attributions. Emotions mediated the links between relationship satisfaction and attributions, suggesting that clinicians working with distressed couples should pay more attention to the emotional climate in which attributions are made. Copyright (c) 2006 APA, all rights reserved.

RF upset susceptibilities of CMOS and low power Schottky D-type flip-flops

NASA Astrophysics Data System (ADS)

Kenneally, Daniel J.; Koellen, Daniel S.; Epshtein, Stan

A description is given of measurements of RF upset levels on two D-type flip-flops, the CD4013B and 54ALS74A, which are functionally identical but fabricated from different technologies: CMOS and low-power Schottky. Continuous-wave electromagnetic interference (CW EMI) from 1 MHz to 200 MHz was coupled into the clock, data, and collector bias, Vcc, ports of each device type while test vectors were used to verify normal operation and subsequent upsets. Both the CMOS and the Schottky devices show decreasing RF susceptibility with increasing frequencies from 1 to 200 MHz. The CMOS device roll-off is almost 18 dB/decade as compared to about 12 dB/decade for the Schottky device. The differences in the Vcc ports' susceptibilities are also apparent. The CMOS device's upset levels decrease steeply with increasing frequency at approximate roll-offs of 60 dB/decade up to 5 MHz and 15 dB/decade from 5 to 100 MHz. Over the same bands, the Schottky device susceptibility at the Vcc port remains strikingly constant at a 6-dBm upset level. Measurements on the clock and data ports seem to suggest that: (1) the CMOS device is `RF harder' than the Schottky device by 3 to 18 dB at least above the 5 to 10 MHz range and out to 100 MHz; and (2) below that range, the Schottky device may be `RF harder' by 3 to 6 dB, but there are not enough measurement data to confirm this performance below 5 MHz.

IRAC Full-Scale Flight Testbed Capabilities

NASA Technical Reports Server (NTRS)

Lee, James A.; Pahle, Joseph; Cogan, Bruce R.; Hanson, Curtis E.; Bosworth, John T.

2009-01-01

Overview: Provide validation of adaptive control law concepts through full scale flight evaluation in a representative avionics architecture. Develop an understanding of aircraft dynamics of current vehicles in damaged and upset conditions Real-world conditions include: a) Turbulence, sensor noise, feedback biases; and b) Coupling between pilot and adaptive system. Simulated damage includes 1) "B" matrix (surface) failures; and 2) "A" matrix failures. Evaluate robustness of control systems to anticipated and unanticipated failures.

Practical Application of a Subscale Transport Aircraft for Flight Research in Control Upset and Failure Conditions

NASA Technical Reports Server (NTRS)

Cunningham, Kevin; Foster, John V.; Morelli, Eugene A.; Murch, Austin M.

2008-01-01

Over the past decade, the goal of reducing the fatal accident rate of large transport aircraft has resulted in research aimed at the problem of aircraft loss-of-control. Starting in 1999, the NASA Aviation Safety Program initiated research that included vehicle dynamics modeling, system health monitoring, and reconfigurable control systems focused on flight regimes beyond the normal flight envelope. In recent years, there has been an increased emphasis on adaptive control technologies for recovery from control upsets or failures including damage scenarios. As part of these efforts, NASA has developed the Airborne Subscale Transport Aircraft Research (AirSTAR) flight facility to allow flight research and validation, and system testing for flight regimes that are considered too risky for full-scale manned transport airplane testing. The AirSTAR facility utilizes dynamically-scaled vehicles that enable the application of subscale flight test results to full scale vehicles. This paper describes the modeling and simulation approach used for AirSTAR vehicles that supports the goals of efficient, low-cost and safe flight research in abnormal flight conditions. Modeling of aerodynamics, controls, and propulsion will be discussed as well as the application of simulation to flight control system development, test planning, risk mitigation, and flight research.

Device and method for shortening reactor process tubes

DOEpatents

Frantz, C.E.; Alexander, W.K.; Lander, W.E.B.

A device and method are described for in situ shortening of nuclear reactor zirconium alloy process tubes which have grown as a result of radiation exposure. An upsetting technique is utilized which involves inductively heating a short band of a process tube with simultaneous application of an axial load sufficient to cause upsetting with an attendant decrease in length of the process tube.

Diagnosis of NMOS DRAM functional performance as affected by a picosecond dye laser

NASA Technical Reports Server (NTRS)

Kim, Q.; Schwartz, H. R.; Edmonds, L. D.; Zoutendyk, J. A.

1992-01-01

A picosec pulsed dye laser beam was at selected wavelengths successfully used to simulate heavy-ion single-event effects (SEEs) in negative channel NMOS DRAMs. A DRAM was used to develop the test technique because bit-mapping capability and previous heavy-ion upset data were available. The present analysis is the first to establish such a correlation between laser and heavy-ion data for devices, such as the NMOS DRAM, where charge collection is dominated by long-range diffusion, which is controlled by carrier density at remote distances from a depletion region. In the latter case, penetration depth is an important parameter and is included in the present analysis. A single-pulse picosecond dye laser beam (1.5 microns diameter) focused onto a single cell component can upset a single memory cell; clusters of memory cell upsets (multiple errors) were observed when the laser energy was increased above the threshold energy. The multiple errors were analyzed as a function of the bias voltage and total energy of a single pulse. A diffusion model to distinguish the multiple upsets from the laser-induced charge agreed well with previously reported heavy ion data.

Magnetic Properties Improvement of Die-upset Nd-Fe-B Magnets by Dy-Cu Press Injection and Subsequent Heat Treatment

NASA Astrophysics Data System (ADS)

Wang, Zexuan; Ju, Jinyun; Wang, Jinzhi; Yin, Wenzong; Chen, Renjie; Li, Ming; Jin, Chaoxiang; Tang, Xu; Lee, Don; Yan, Aru

2016-12-01

Ultrafine-grained die-upset Nd-Fe-B magnets are of importance because they provide a wide researching space to redesign the textured structures. Here is presented a route to obtain a new die-upset magnet with substantially improved magnetic properties. After experiencing the optimized heat treatment, both the coercivity and remanent magnetization of the Dy-Cu press injected magnets increased substantially in comparison with those of the annealed reference magnets, which is distinct from the reported experimental results on heavy rare-earth diffusion. To study the mechanism, we analyzed the texture evolution in high-temperature annealed die-upset magnets, which had significant impact on the improvement of remanent magnetization. On basis of the results, we find that the new structures are strongly interlinked with the initial structures. With injecting Dy-Cu eutectic alloy, an optimized initial microstructure was achieved in the near-surface diffused regions, which made preparations for the subsequent texture improvement. Besides, the Dy gradient distribution of near-surface regions of the Dy-Cu press injected magnets was also investigated. By controlling the initial microstructure and subsequent diffusion process, a higher performance magnet is expected to be obtained.

Magnetic Properties Improvement of Die-upset Nd-Fe-B Magnets by Dy-Cu Press Injection and Subsequent Heat Treatment

PubMed Central

Wang, Zexuan; Ju, Jinyun; Wang, Jinzhi; Yin, Wenzong; Chen, Renjie; Li, Ming; Jin, Chaoxiang; Tang, Xu; Lee, Don; Yan, Aru

2016-01-01

Ultrafine-grained die-upset Nd-Fe-B magnets are of importance because they provide a wide researching space to redesign the textured structures. Here is presented a route to obtain a new die-upset magnet with substantially improved magnetic properties. After experiencing the optimized heat treatment, both the coercivity and remanent magnetization of the Dy-Cu press injected magnets increased substantially in comparison with those of the annealed reference magnets, which is distinct from the reported experimental results on heavy rare-earth diffusion. To study the mechanism, we analyzed the texture evolution in high-temperature annealed die-upset magnets, which had significant impact on the improvement of remanent magnetization. On basis of the results, we find that the new structures are strongly interlinked with the initial structures. With injecting Dy-Cu eutectic alloy, an optimized initial microstructure was achieved in the near-surface diffused regions, which made preparations for the subsequent texture improvement. Besides, the Dy gradient distribution of near-surface regions of the Dy-Cu press injected magnets was also investigated. By controlling the initial microstructure and subsequent diffusion process, a higher performance magnet is expected to be obtained. PMID:27922060

Report of the Commission to Assess the Threat to the United States from Electromagnetic Pulse (EMP) Attack: Critical National Infrastructures

DTIC Science & Technology

2008-04-01

consumers and electric utilities in Arizona and Southern California. Twelve people, including five children, died as a result of the explosion. The...Modern electronics, communications, pro- tection, control and computers have allowed the physical system to be utilized fully with ever smaller... margins for error. Therefore, a relatively modest upset to the system can cause functional collapse. As the system grows in complexity and interdependence

Verification of a SEU model for advanced 1-micron CMOS structures using heavy ions

NASA Technical Reports Server (NTRS)

Cable, J. S.; Carter, J. R.; Witteles, A. A.

1986-01-01

Modeling and test results are reported for 1 micron CMOS circuits. Analytical predictions are correlated with experimental data, and sensitivities to process and design variations are discussed. Unique features involved in predicting the SEU performance of these devices are described. The results show that the critical charge for upset exhibits a strong dependence on pulse width for very fast devices, and upset predictions must factor in the pulse shape. Acceptable SEU error rates can be achieved for a 1 micron bulk CMOS process. A thin retrograde well provides complete SEU immunity for N channel hits at normal incidence angle. Source interconnect resistance can be important parameter in determining upset rates, and Cf-252 testing can be a valuable tool for cost-effective SEU testing.

Radiation Effects of Commercial Resistive Random Access Memories

NASA Technical Reports Server (NTRS)

Chen, Dakai; LaBel, Kenneth A.; Berg, Melanie; Wilcox, Edward; Kim, Hak; Phan, Anthony; Figueiredo, Marco; Buchner, Stephen; Khachatrian, Ani; Roche, Nicolas

2014-01-01

We present results for the single-event effect response of commercial production-level resistive random access memories. We found that the resistive memory arrays are immune to heavy ion-induced upsets. However, the devices were susceptible to single-event functional interrupts, due to upsets from the control circuits. The intrinsic radiation tolerant nature of resistive memory makes the technology an attractive consideration for future space applications.

Device and method for shortening reactor process tubes

DOEpatents

Frantz, Charles E.; Alexander, William K.; Lander, Walter E. B.

1980-01-01

This disclosure describes a device and method for in situ shortening of nuclear reactor zirconium alloy process tubes which have grown as a result of radiation exposure. An upsetting technique is utilized which involves inductively heating a short band of a process tube with simultaneous application of an axial load sufficient to cause upsetting with an attendant decrease in length of the process tube.

Application of RADSAFE to Model Single Event Upset Response of a 0.25 micron CMOS SRAM

NASA Technical Reports Server (NTRS)

Warren, Kevin M.; Weller, Robert A.; Sierawski, Brian; Reed, Robert A.; Mendenhall, Marcus H.; Schrimpf, Ronald D.; Massengill, Lloyd; Porter, Mark; Wilkerson, Jeff; LaBel, Kenneth A.;

Single event upset in avionics

DOE Office of Scientific and Technical Information (OSTI.GOV)

Taber, A.; Normand, E.

1993-04-01

Data from military/experimental flights and laboratory testing indicate that typical non radiation-hardened 64K and 256K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction (EDAC) circuitry be considered for all avionics designs containing large amounts of semi-conductor memory.

Single event upset susceptibility testing of the Xilinx Virtex II FPGA

NASA Technical Reports Server (NTRS)

Yui, C.; Swift, G.; Carmichael, C.

2002-01-01

Heavy ion testing of the Xilinx Virtex IZ was conducted on the configuration, block RAM and user flip flop cells to determine their single event upset susceptibility using LETs of 1.2 to 60 MeVcm^2/mg. A software program specifically designed to count errors in the FPGA is used to reveal L1/e values and single-event-functional interrupt failures.

Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices

NASA Technical Reports Server (NTRS)

Berg, M.; Kim, H.; Phan, A.; Seidleck, C.; LaBel, K.; Pellish, J.; Campola, M.

2015-01-01

Space applications are complex systems that require intricate trade analyses for optimum implementations. We focus on a subset of the trade process, using classical reliability theory and SEU data, to illustrate appropriate TMR scheme selection.

Building A Help Desk System

ERIC Educational Resources Information Center

O'Shea, Sheryl

2005-01-01

Are you trying to support an entire school district full of computers with just a few hardware technicians? Do you have a non-technical person answering the phone? Are the teachers getting upset because of the length of time it takes to resolve their issues? Unfortunately, I had to answer yes to all three questions. Our school district includes…

Single Event Testing on Complex Devices: Test Like You Fly versus Test-Specific Design Structures

NASA Technical Reports Server (NTRS)

Berg, Melanie; LaBel, Kenneth A.

2014-01-01

We present a framework for evaluating complex digital systems targeted for harsh radiation environments such as space. Focus is limited to analyzing the single event upset (SEU) susceptibility of designs implemented inside Field Programmable Gate Array (FPGA) devices. Tradeoffs are provided between application-specific versus test-specific test structures.

Petersen Multipliers for Several SEU (Single Event Upset) Environment Models.

DTIC Science & Technology

1986-09-30

The Aerospace Corporation El Segundo, CA 90245 30 Scptcmbcr 1986 Prepared for SPACE DIVISION AIR FORCE SYSTEMS COMMAND 0Los Angeles Air Force Station...X (pC/om)2 /Um " (for S in Pm2 and for in picocoulombs per um). (In another system of units, the constant in the equation for F, above, takes the...distributions that may be expected under a wide variety of conditions. These models have since become standards for use in the specification of system

A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM

NASA Astrophysics Data System (ADS)

Wang, Bin; Zeng, Chuanbin; Geng, Chao; Liu, Tianqi; Khan, Maaz; Yan, Weiwei; Hou, Mingdong; Ye, Bing; Sun, Youmei; Yin, Yanan; Luo, Jie; Ji, Qinggang; Zhao, Fazhan; Liu, Jie

2017-09-01

Single event upset (SEU) susceptibility of unhardened 6T/SRAM and hardened active delay element (ADE)/SRAM, fabricated with 0.35 μm silicon-on-insulator (SOI) CMOS technology, was investigated at heavy ion accelerator. The mechanisms were revealed by the laser irradiation and resistor-capacitor hardened techniques. Compared with conventional 6T/SRAM, the hardened ADE/SRAM exhibited higher tolerance to heavy ion irradiation, with an increase of about 80% in the LET threshold and a decrease of ∼64% in the limiting upset cross-section. Moreover, different probabilities between 0 → 1 and 1 → 0 transitions were observed, which were attributed to the specific architecture of ADE/SRAM memory cell. Consequently, the radiation-hardened technology can be an attractive alternative to the SEU tolerance of the device-level.

Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing

NASA Technical Reports Server (NTRS)

Nichols, Donald K.; Huebner, Mark A.; Price, William E.; Smith, L. S.; Coss, James R.

1988-01-01

The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands on the abbreviated test data presented as part of Refs. (1) and (3) by including figures of Single Event Upset (SEU) cross sections as a function of beam Linear Energy Transfer (LET) when available. It also includes some of the data complied in the JPL computer in RADATA and the SPACERAD data bank. This volume encompasses bipolar and MOS (CMOS and MHNOS) device data as two broad categories for both upsets (bit-flips) and latchup. It also includes comments on less well known phenomena, such as transient upsets and permanent damage modes.

Single event upset sensitivity of low power Schottky devices

NASA Technical Reports Server (NTRS)

Price, W. E.; Nichols, D. K.; Measel, P. R.; Wahlin, K. L.

1982-01-01

Data taken from tests involving heavy ions in the Berkeley 88 in. cyclotron being directed at low power Schottky barrier devices are reported. The tests also included trials in the Harvard cyclotron with 130 MeV protons, and at the U.C. Davis cyclotron using 56 MeV protons. The experiments were performed to study the single event upsets in MSI logic devices containing flip-flops. Results are presented of single-event upsets (SEU) causing functional degradation observed in post-exposure tests of six different devices. The effectiveness of the particles in producing SEUs in logic device functioning was found to be directly proportional to the proton energy. Shielding was determined to offer negligible protection from the particle bombardment. The results are considered significant for the design and fabrication of LS devices for space applications.

Experimental Research and Method for Calculation of 'Upsetting-with-Buckling' Load at the Impression-Free (Dieless) Preforming of Workpiece

NASA Astrophysics Data System (ADS)

Kukhar, Volodymir; Artiukh, Victor; Prysiazhnyi, Andrii; Pustovgar, Andrey

2018-03-01

This paper presents the results of experimental studies of load characteristic changes during the upsetting of high billets with the upsetting ratio (height to diameter ratio) from 3.0 to 6.0, which is followed by buckling. Such pass is an effective way of preforming the workpiece for production of forgings with a bended axis or dual forming, and belongs to impression-free (dieless) operation of bulk forming. Based on the experimental data analysis, an engineering method for calculation of workpiece pre-forming load as a maximum buckling force has been developed. The analysis of the obtained data confirmed the possibility of performing of this pre-forming operation on the main forging equipment, since the load of shaping by buckling does not exceed the load of the dieforging.

Characterizing SRAM Single Event Upset in Terms of Single and Double Node Charge Collection

NASA Technical Reports Server (NTRS)

Black, J. D.; Ball, D. R., II; Robinson, W. H.; Fleetwood, D. M.; Schrimpf, R. D.; Reed, R. A.; Black, D. A.; Warren, K. M.; Tipton, A. D.; Dodd, P. E.;

Studies Of Single-Event-Upset Models

NASA Technical Reports Server (NTRS)

Zoutendyk, J. A.; Smith, L. S.; Soli, G. A.

1988-01-01

Report presents latest in series of investigations of "soft" bit errors known as single-event upsets (SEU). In this investigation, SEU response of low-power, Schottky-diode-clamped, transistor/transistor-logic (TTL) static random-access memory (RAM) observed during irradiation by Br and O ions in ranges of 100 to 240 and 20 to 100 MeV, respectively. Experimental data complete verification of computer model used to simulate SEU in this circuit.

Effects of Cabin Upsets on Adsorption Columns for Air Revitalization

NASA Technical Reports Server (NTRS)

LeVan, Douglas

1999-01-01

The National Aeronautics and Space Administration (NASA) utilizes adsorption technology as part of contaminant removal systems designed for long term missions. A variety of trace contaminants can be effectively removed from gas streams by adsorption onto activated carbon. An activated carbon adsorption column meets NASA's requirements of a lightweight and efficient means of controlling trace contaminant levels aboard spacecraft and space stations. The activated carbon bed is part of the Trace Contaminant Control System (TCCS) which is utilized to purify the cabin atmosphere. TCCS designs oversize the adsorption columns to account for irregular fluctuations in cabin atmospheric conditions. Variations in the cabin atmosphere include changes in contaminant concentrations, temperature, and relative humidity. Excessively large deviations from typical conditions can result from unusual crew activity, equipment malfunctions, or even fires. The research carried out under this award focussed in detail on the effects of cabin upsets on the performance of activated carbon adsorption columns. Both experiments and modeling were performed with an emphasis on the roll of a change in relative humidity on adsorption of trace contaminants. A flow through fixed-bed apparatus was constructed at the NASA Ames Research Center, and experiments were performed there. Modeling work was performed at the University of Virginia.

Intelligent Extruder

DOE Office of Scientific and Technical Information (OSTI.GOV)

AlperEker; Mark Giammattia; Paul Houpt

''Intelligent Extruder'' described in this report is a software system and associated support services for monitoring and control of compounding extruders to improve material quality, reduce waste and energy use, with minimal addition of new sensors or changes to the factory floor system components. Emphasis is on process improvements to the mixing, melting and de-volatilization of base resins, fillers, pigments, fire retardants and other additives in the :finishing'' stage of high value added engineering polymer materials. While GE Plastics materials were used for experimental studies throughout the program, the concepts and principles are broadly applicable to other manufacturers materials. Themore » project involved a joint collaboration among GE Global Research, GE Industrial Systems and Coperion Werner & Pleiderer, USA, a major manufacturer of compounding equipment. Scope of the program included development of a algorithms for monitoring process material viscosity without rheological sensors or generating waste streams, a novel detection scheme for rapid detection of process upsets and an adaptive feedback control system to compensate for process upsets where at line adjustments are feasible. Software algorithms were implemented and tested on a laboratory scale extruder (50 lb/hr) at GE Global Research and data from a production scale system (2000 lb/hr) at GE Plastics was used to validate the monitoring and detection software. Although not evaluated experimentally, a new concept for extruder process monitoring through estimation of high frequency drive torque without strain gauges is developed and demonstrated in simulation. A plan to commercialize the software system is outlined, but commercialization has not been completed.« less

On the Addition of EM Field Propagation and Coupling Effects in the BLT Equation. Revision

DTIC Science & Technology

2004-06-08

which collectively are referred to as high power electromagnetic ( HPEM ) fields, could be inadvertent, like the environment produced by a search...either case, the effects of these HPEM fields may include system upset, and in some cases, permanent damage. Figure 1 illustrates a simple example of...an electrical system excited by an external HPEM source. This energy source can provide either a narrow-band pulsed EM field, or a fast transient

SEU hardened memory cells for a CCSDS Reed Solomon encoder

DOE Office of Scientific and Technical Information (OSTI.GOV)

Whitaker, S.; Canaris, J.; Liu, K.

This paper reports on design technique to harden CMOS memory circuits against Single Event Upset (SEU) in the space environment. The design technique provides a recovery mechanism which is independent of the shape of the upsetting event. A RAM cell and Flip Flop design are presented to demonstrate the method. The Flip Flop was used in the control circuitry for a Reed Solomon encoder designed for the Space Station and Explorer platforms.

Evaluation of the StressWave Cold Working (SWCW) Process on High-Strength Aluminum Alloys for Aerospace

DTIC Science & Technology

2009-02-01

Alloy Spot- welds by Cold Working,” 13 International Pacific Conference on Automotive Engineering (IPC-13), Gyeongju, Korea, August 2005. 7. Kim...so that it remains normal to the indenting direction. The restraint provided around the area to be cold worked minimizes surface upset (albeit...direction. The restraint provided around the area to be cold worked minimizes surface upset (albeit small without a PF). The stabilizing aspect

Evaluation of the Radiation Susceptibility of a 3D NAND Flash Memory

NASA Technical Reports Server (NTRS)

Chen, Dakai; Wilcox, Edward; Ladbury, Raymond; Seidleck, Christina; Kim, Hak; Phan, Anthony; LaBel, Kenneth

2017-01-01

We evaluated the heavy ion and proton-induced single-event effects (SEE) for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of similar density and performance in the multiple-cell level (MLC) storage mode. However, the single-level-cell (SLC) storage mode of the 3D NAND showed significantly reduced SEU susceptibility. Additionally, the 3D NAND showed less MBU susceptibility than the planar NAND, with reduced number of upset bits per byte and reduced cross sections overall. However, the 3D architecture exhibited angular sensitivities for both base and face angles, reflecting the anisotropic nature of the SEU vulnerability in space. Furthermore, the SEU cross section decreased with increasing fluence for both the 3D NAND and the latest generation planar NAND, indicating a variable upset rate for a space mission. These unique characteristics introduce complexity to traditional ground irradiation test procedures.

Self-efficacy for controlling upsetting thoughts and emotional eating in family caregivers.

PubMed

MacDougall, Megan; Steffen, Ann

2017-10-01

Self-efficacy for controlling upsetting thoughts was examined as a predictor of emotional eating by family caregivers of physically and cognitively impaired older adults. Adult women (N = 158) providing healthcare assistance for an older family member completed an online survey about caregiving stressors, depressive symptoms, self-efficacy, and emotional eating. A stress process framework was used as a conceptual model to guide selection of variables predicting emotional eating scores. A hierarchical multiple regression was conducted and the overall model was significant (R 2 = .21, F(4,153) = 10.02, p < .01); self-efficacy for controlling upsetting thoughts was a significant predictor of caregivers' emotional eating scores after accounting for IADL, role overload, and depression scores. These findings replicate previous research demonstrating the relationship between managing cognitions about caregiving and behavioral responses to stressors, and point to the importance of addressing cognitive processes in efforts to improve caregiver health behaviors.

Does the Risk Outweigh the Benefits? Adolescent Responses to Completing Health Surveys.

PubMed

Shaw, Thérèse; Runions, Kevin C; Johnston, Robyn S; Cross, Donna

2018-06-01

The aim of this study is to describe the self-reported experiences of adolescents in population-based samples when completing health-related surveys on topics with varying potential for evoking distress. Survey data were collected in three school-based studies of bullying behaviors (N = 1,771, 12-14 years), alcohol use (N = 823, 12, 15, and 17 years), and electronic image sharing (N = 274, 13 years). Between 5% and 15% of respondents reported being upset at survey completion, but at most 1.4% were entirely negative in their evaluation. Age was not associated with being upset, but younger adolescents were more likely to see benefit in participation. Although concurrent mental health symptoms increased the risk of being upset, this was mostly mitigated by perceived benefits from participation. © 2017 Society for Research on Adolescence.

Transient fault behavior in a microprocessor: A case study

NASA Technical Reports Server (NTRS)

Duba, Patrick

1989-01-01

An experimental analysis is described which studies the susceptibility of a microprocessor based jet engine controller to upsets caused by current and voltage transients. A design automation environment which allows the run time injection of transients and the tracing from their impact device to the pin level is described. The resulting error data are categorized by the charge levels of the injected transients by location and by their potential to cause logic upsets, latched errors, and pin errors. The results show a 3 picoCouloumb threshold, below which the transients have little impact. An Arithmetic and Logic Unit transient is most likely to result in logic upsets and pin errors (i.e., impact the external environment). The transients in the countdown unit are potentially serious since they can result in latched errors, thus causing latent faults. Suggestions to protect the processor against these errors, by incorporating internal error detection and transient suppression techniques, are also made.

Effect of upsetting deformation temperature on the formation of the fine-grained cast alloy structure of the Ni-Mn-Ga system

NASA Astrophysics Data System (ADS)

Musabirov, I. I.; Safarov, I. M.; Sharipov, I. Z.; Nagimov, M. I.; Koledov, V. V.; Khovailo, V. V.; Mulyukov, R. R.

2017-08-01

The plastic behavior during deformation by upsetting and its effect on the microstructure in the polycrystalline Ni2.19Fe0.04Mn0.77Ga alloy are studied. The temperatures of martensitic and magnetic phase transformations were determined by the method for analyzing the temperature dependence of the specific magnetization as M F = 320 K, A S = 360 K, and T C = 380 K. Using differential scanning calorimetry, it is shown that the phase transition from the ordered phase L21 to the disordered phase B2 is observed in the alloy during sample heating in the temperature range of 930-1070 K. The melting temperature is 1426 K. An analysis of the load curves constructed for sample deposition at temperatures of 773, 873, and 973 K shows that the behavior of the stress-strain curve at a temperature of 773 K is inherent to cold deformation. The behavior of the dependences for 873 and 973 K is typical of hot deformation. After deforming the alloy, its microstructure is studied using backscattered scanning electron microscopy. Plastic deformation of the alloy at study temperatures results in grain structure fragmentation in the localized deformation region. At all temperatures, a recrystallized grain structure is observed. It is found that the structure is heterogeneously recrystallized after upsetting at 973 K due to the process intensity at such a high temperature. The alloy microstructure after plastic deformation at a temperature of 873 K is most homogeneous in terms of the average grain size.

Causal relationships between solar proton events and single event upsets for communication satellites

NASA Astrophysics Data System (ADS)

Lohmeyer, W. Q.; Cahoy, K.; Liu, Shiyang

In this work, we analyze a historical archive of single event upsets (SEUs) maintained by Inmarsat, one of the world's leading providers of global mobile satellite communications services. Inmarsat has operated its geostationary communication satellites and collected extensive satellite anomaly and telemetry data since 1990. Over the course of the past twenty years, the satellites have experienced more than 226 single event upsets (SEUs), a catch-all term for anomalies that occur in a satellite's electronics such as bit-flips, trips in power supplies, and memory changes in attitude control systems. While SEUs are seemingly random and difficult to predict, we correlate their occurrences to space weather phenomena, and specifically show correlations between SEUs and solar proton events (SPEs). SPEs are highly energetic protons that originate from solar coronal mass ejections (CMEs). It is thought that when these particles impact geostationary (GEO) satellites they can cause SEUs as well as solar array degradation. We calculate the associated statistical correlations that each SEU occurs within one day, one week, two weeks, and one month of 10 MeV SPEs between 10 - 10,000 particle flux units (pfu). However, we find that SPEs are most prevalent at solar maximum and that the SEUs on Inmarsat's satellites occur out of phase with the solar maximum. Ultimately, this suggests that SPEs are not the primary cause of the Inmarsat SEUs. A better understanding of the causal relationship between SPEs and SEUs will help the satellite communications industry develop component and operational space weather mitigation techniques as well as help the space weather community to refine radiation models.

Textural states of a hot-worked MA2-1 magnesium alloy

NASA Astrophysics Data System (ADS)

Serebryany, V. N.; Kochubei, A. Ya.; Kurtasov, S. F.; Mel'Nikov, K. E.

2007-02-01

Quantitative texture analysis is used to study texture formation in an MA2-1 magnesium alloy subjected to axisymmetric upsetting at temperatures of 250-450°C and strain rates of 10-4-100 -1. The deformed structure is examined by optical microscopy, and the results obtained are used to plot the structural-state diagram of the alloy after 50% upsetting. The experimental textures are compared with the textures calculated in terms of a thermoactivation model.

A Model for Microcontroller Functionality Upset Induced by External Pulsed Electromagnetic Irradiation

DTIC Science & Technology

2016-11-21

AFRL-RD-PS- AFRL-RD-PS- TN-2016-0003 TN-2016-0003 A Model for Microcontroller Functionality Upset Induced by External Pulsed Electromagnetic ...External Pulsed Electromagnetic Irradiation 5a. CONTRACT NUMBER FA9451-15-C-0004 5b. GRANT NUMBER 5c. PROGRAM ELEMENT NUMBER 6 . AUTHOR(S) David...microcontroller (µC) subjected to external irradiation by a narrowband electromagnetic (EM) pulse. In our model, the state of a µC is completely specified by

Multi-stage FE simulation of hot ring rolling

NASA Astrophysics Data System (ADS)

Wang, C.; Geijselaers, H. J. M.; van den Boogaard, A. H.

2013-05-01

As a unique and important member of the metal forming family, ring rolling provides a cost effective process route to manufacture seamless rings. Applications of ring rolling cover a wide range of products in aerospace, automotive and civil engineering industries [1]. Above the recrystallization temperature of the material, hot ring rolling begins with the upsetting of the billet cut from raw stock. Next a punch pierces the hot upset billet to form a hole through the billet. This billet, referred to as preform, is then rolled by the ring rolling mill. For an accurate simulation of hot ring rolling, it is crucial to include the deformations, stresses and strains from the upsetting and piercing process as initial conditions for the rolling stage. In this work, multi-stage FE simulations of hot ring rolling process were performed by mapping the local deformation state of the workpiece from one step to the next one. The simulations of upsetting and piercing stages were carried out by 2D axisymmetric models using adaptive remeshing and element erosion. The workpiece for the ring rolling stage was subsequently obtained after performing a 2D to 3D mapping. The commercial FE package LS-DYNA was used for the study and user defined subroutines were implemented to complete the control algorithm. The simulation results were analyzed and also compared with those from the single-stage FE model of hot ring rolling.

The Galileo Attitude and Articulation Control System - A radiation-hard, high precision, state-of-the-art control system

NASA Technical Reports Server (NTRS)

Rhoads Stephenson, R.

1986-01-01

The Galileo Mission and Spacecraft design impose tight requirements on the Attitude and Articulation Control System (AACS). These requirements, coupled with the flexible spacecraft, the need for autonomy, and a severe radiation environment, pose a great challenge for the AACS designer. The resulting design and implementation are described, along with the discovery and solution of the Single-Event Upset problem. The status of the testing of the AACS in the Integration and Test Laboratory as well as at the spacecraft level is summarized.

Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

NASA Technical Reports Server (NTRS)

Allen, Gregory; Edmonds, Larry D.; Swift, Gary; Carmichael, Carl; Tseng, Chen Wei; Heldt, Kevin; Anderson, Scott Arlo; Coe, Michael

2010-01-01

We present a test methodology for estimating system error rates of Field Programmable Gate Arrays (FPGAs) mitigated with Triple Modular Redundancy (TMR). The test methodology is founded in a mathematical model, which is also presented. Accelerator data from 90 nm Xilins Military/Aerospace grade FPGA are shown to fit the model. Fault injection (FI) results are discussed and related to the test data. Design implementation and the corresponding impact of multiple bit upset (MBU) are also discussed.

Single event effects in pulse width modulation controllers

DOE Office of Scientific and Technical Information (OSTI.GOV)

Penzin, S.H.; Crain, W.R.; Crawford, K.B.

1996-12-01

SEE testing was performed on pulse width modulation (PWM) controllers which are commonly used in switching mode power supply systems. The devices are designed using both Set-Reset (SR) flip-flops and Toggle (T) flip-flops which are vulnerable to single event upset (SEU) in a radiation environment. Depending on the implementation of the different devices the effect can be significant in spaceflight hardware.

Solar Particle Induced Upsets in the TDRS-1 Attitude Control System RAM During the October 1989 Solar Particle Events

NASA Technical Reports Server (NTRS)

Croley, D. R.; Garrett, H. B.; Murphy, G. B.; Garrard,T. L.

1995-01-01

The three large solar particle events, beginning on October 19, 1989 and lasting approximately six days, were characterized by high fluences of solar protons and heavy ions at 1 AU. During these events, an abnormally large number of upsets (243) were observed in the random access memory of the attitude control system (ACS) control processing electronics (CPE) on-board the geosynchronous TDRS-1 (Telemetry and Data Relay Satellite). The RAM unit affected was composed of eight Fairchild 93L422 memory chips. The Galileo spacecraft, launched on October 18, 1989 (one day prior to the solar particle events) observed the fluxes of heavy ions experienced by TDRS-1. Two solid-state detector telescopes on-board Galileo, designed to measure heavy ion species and energy, were turned on during time periods within each of the three separate events. The heavy ion data have been modeled and the time history of the events reconstructed to estimate heavy ion fluences. These fluences were converted to effective LET spectra after transport through the estimated shielding distribution around the TDRS-1 ACS system. The number of single event upsets (SEU) expected was calculated by integrating the measured cross section for the Fairchild 93L422 memory chip with average effective LET spectrum. The expected number of heavy ion induced SEU's calculated was 176. GOES-7 proton data, observed during the solar particle events, were used to estimate the number of proton-induced SEU's by integrating the proton fluence spectrum incident on the memory chips, with the two-parameter Bendel cross section for proton SEU'S. The proton fluence spectrum at the device level was gotten by transporting the protons through the estimated shielding distribution. The number of calculated proton-induced SEU's was 72, yielding a total of 248 predicted SEU'S, very dose to the 243 observed SEU'S. These calculations uniquely demonstrate the roles that solar heavy ions and protons played in the production of SEU's during the October 1989 solar particle events.

Targeting and managing behavioral symptoms in individuals with dementia: a randomized trial of a nonpharmacological intervention.

PubMed

Gitlin, Laura N; Winter, Laraine; Dennis, Marie P; Hodgson, Nancy; Hauck, Walter W

2010-08-01

To test the effects of an intervention that helps families manage distressing behaviors in family members with dementia. Two-group randomized trial. In home. Two hundred seventy-two caregivers and people with dementia. Up to 11 home and telephone contacts over 16 weeks by health professionals who identified potential triggers of patient behaviors, including communication and environmental factors and patient undiagnosed medical conditions (by obtaining blood and urine samples) and trained caregivers in strategies to modify triggers and reduce their upset. Between 16 and 24 weeks, three telephone contacts reinforced strategy use. Primary outcomes were frequency of targeted problem behavior and caregiver upset with and confidence managing it at 16 weeks. Secondary outcomes were caregiver well-being and management skills at 16 and 24 weeks and caregiver perceived benefits. Prevalence of medical conditions for intervention patients were also examined. At 16 weeks, 67.5% of intervention caregivers reported improvement in targeted problem behavior, compared with 45.8% of caregivers in a no-treatment control group (P=.002), and reduced upset with (P=.03) and enhanced confidence managing (P=.01) the behavior. Additionally, intervention caregivers reported less upset with all problem behaviors (P=.001), less negative communication (P=.02), less burden (P=.05), and better well-being (P=.001) than controls. Fewer intervention caregivers had depressive symptoms (53.0%) than control group caregivers (67.8%, P=.02). Similar caregiver outcomes occurred at 24 weeks. Intervention caregivers perceived more study benefits (P<.05), including ability to keep family members home, than controls. Blood and urine samples of intervention patients with dementia showed that 40 (34.1%) had undiagnosed illnesses requiring physician follow-up. Targeting behaviors upsetting to caregivers and modifying potential triggers improves symptomatology in people with dementia and caregiver well-being and skills. © 2010, Copyright the Authors. Journal compilation © 2010, The American Geriatrics Society.

Morbidity Rates during a Military Cold Weather Exercise: Empire Glacier 1980.

DTIC Science & Technology

1981-10-28

stomach upset, or pain and hemorrhoids . Flu constituted 9.6% of the GI cases (although more appropriately might have been included with URI). The...COMPLAINTS Eleven-day Totals Ave./Day Rates* 1. Nausea (Upset Stomach) 33 (3.0) .34 2. Stomach Pain 26 (2.4) .27 3. Hemorrhoids 18 (1.6) .18 Flu...Reported that cold usually bothers him, that hemorrhoids are aggravated by the cold. Doesn’t care for cold weather in general. No classroom instruction and

Finite element analysis of the upsetting of a 5056 aluminum alloy sample with consideration of its microstructure

NASA Astrophysics Data System (ADS)

Voronin, S. V.; Chaplygin, K. K.

2017-12-01

Computer simulation of upsetting the finite element models (FEMs) of an isotropic 5056 aluminum alloy sample and a 5056 aluminum alloy sample with consideration of microstructure is carried out. The stress and strain distribution patterns at different process stages are obtained. The strain required for the deformation of the FEMs of 5056 alloy samples is determined. The influence of the material microstructure on the stress-strain behavior and technological parameters are demonstrated.

Single event upset suspectibility testing of the Xilinx Virtex II FPGA

NASA Technical Reports Server (NTRS)

Carmichael, C.; Swift, C.; Yui, G.

2002-01-01

Heavy ion testing of the Xilinx Virtex II was conducted on the configuration, block RAM and user flip flop cells to determine their static single-event upset susceptibility using LETs of 1.2 to 60 MeVcm^2/mg. A software program specifically designed to count errors in the FPGA was used to reveal L1/e, values (the LET at which the cross section is l/e times the saturation cross-section) and single-event functional-interrupt failures.

Empirical modeling of Single-Event Upset (SEU) in NMOS depletion-mode-load static RAM (SRAM) chips

NASA Technical Reports Server (NTRS)

Zoutendyk, J. A.; Smith, L. S.; Soli, G. A.; Smith, S. L.; Atwood, G. E.

1986-01-01

A detailed experimental investigation of single-event upset (SEU) in static RAM (SRAM) chips fabricated using a family of high-performance NMOS (HMOS) depletion-mode-load process technologies, has been done. Empirical SEU models have been developed with the aid of heavy-ion data obtained with a three-stage tandem van de Graaff accelerator. The results of this work demonstrate a method by which SEU may be empirically modeled in NMOS integrated circuits.

Radiation tolerant combinational logic cell

NASA Technical Reports Server (NTRS)

Maki, Gary R. (Inventor); Whitaker, Sterling (Inventor); Gambles, Jody W. (Inventor)

2009-01-01

A system has a reduced sensitivity to Single Event Upset and/or Single Event Transient(s) compared to traditional logic devices. In a particular embodiment, the system includes an input, a logic block, a bias stage, a state machine, and an output. The logic block is coupled to the input. The logic block is for implementing a logic function, receiving a data set via the input, and generating a result f by applying the data set to the logic function. The bias stage is coupled to the logic block. The bias stage is for receiving the result from the logic block and presenting it to the state machine. The state machine is coupled to the bias stage. The state machine is for receiving, via the bias stage, the result generated by the logic block. The state machine is configured to retain a state value for the system. The state value is typically based on the result generated by the logic block. The output is coupled to the state machine. The output is for providing the value stored by the state machine. Some embodiments of the invention produce dual rail outputs Q and Q'. The logic block typically contains combinational logic and is similar, in size and transistor configuration, to a conventional CMOS combinational logic design. However, only a very small portion of the circuits of these embodiments, is sensitive to Single Event Upset and/or Single Event Transients.

Annual Conference on Nuclear and Space Radiation Effects, 18th, University of Washington, Seattle, WA, July 21-24, 1981, Proceedings

NASA Technical Reports Server (NTRS)

Tasca, D. M.

1981-01-01

Single event upset phenomena are discussed, taking into account cosmic ray induced errors in IIL microprocessors and logic devices, single event upsets in NMOS microprocessors, a prediction model for bipolar RAMs in a high energy ion/proton environment, the search for neutron-induced hard errors in VLSI structures, soft errors due to protons in the radiation belt, and the use of an ion microbeam to study single event upsets in microcircuits. Basic mechanisms in materials and devices are examined, giving attention to gamma induced noise in CCD's, the annealing of MOS capacitors, an analysis of photobleaching techniques for the radiation hardening of fiber optic data links, a hardened field insulator, the simulation of radiation damage in solids, and the manufacturing of radiation resistant optical fibers. Energy deposition and dosimetry is considered along with SGEMP/IEMP, radiation effects in devices, space radiation effects and spacecraft charging, EMP/SREMP, and aspects of fabrication, testing, and hardness assurance.

Prediction Accuracy of Error Rates for MPTB Space Experiment

NASA Technical Reports Server (NTRS)

Buchner, S. P.; Campbell, A. B.; Davis, D.; McMorrow, D.; Petersen, E. L.; Stassinopoulos, E. G.; Ritter, J. C.

1998-01-01

This paper addresses the accuracy of radiation-induced upset-rate predictions in space using the results of ground-based measurements together with standard environmental and device models. The study is focused on two part types - 16 Mb NEC DRAM's (UPD4216) and 1 Kb SRAM's (AMD93L422) - both of which are currently in space on board the Microelectronics and Photonics Test Bed (MPTB). To date, ground-based measurements of proton-induced single event upset (SEM cross sections as a function of energy have been obtained and combined with models of the proton environment to predict proton-induced error rates in space. The role played by uncertainties in the environmental models will be determined by comparing the modeled radiation environment with the actual environment measured aboard MPTB. Heavy-ion induced upsets have also been obtained from MPTB and will be compared with the "predicted" error rate following ground testing that will be done in the near future. These results should help identify sources of uncertainty in predictions of SEU rates in space.

Effect of Friction on Barreling during cold Upset Forging of Aluminium 6082 Alloy Solid cylinders

NASA Astrophysics Data System (ADS)

Priyadarshini, Amrita; Kiran, C. P.; Suresh, K.

2018-03-01

Friction is one of the significant factors in forging operations since it affects metal flow in the die, forming load, strain distribution, tool and die life, surface quality of the product etc. In upset forging, the frictional forces at the die-workpiece interface oppose the outward flow of the material due to which the specimen develops a barrel shape. As a result, the deformation becomes non-uniform or inhomogeneous which is undesirable. Barreling can be reduced by applying effective lubricant on the surface of the platens. The objective of the present work is to study experimentally the effect of various frictional conditions (dry, grease, mineral oil) on barreling during upset forging of aluminum 6082 solid cylinders of different aspect ratio (length/diameter: 0.5, 0.75, 1). The friction coefficients are determined using the ring compression test. Curvature of barrel is determined based on the assumption that the curvature of the barrel follows the geometry of circular arc.

Causes and solutions to surface facilities upsets following acid stimulation in the Gulf of Mexico

DOE Office of Scientific and Technical Information (OSTI.GOV)

Durham, D.K.; Stone, P.J.; Ali, S.A.

1997-02-01

This paper presents test data on the effects of acid and acid additives on emulsion and water treating in the Gulf of Mexico. This work also discusses the test methods developed to select acid additives and treating chemicals that will allow the producer to treat both oil and water more consistently and cost effectively while the acid flowback is in the system. It also presents system results that confirm the importance of the joint selection of acid and surface treating additives and show that significant cost savings can be gained by use of this process. Also discussed are the propermore » system application techniques for treating chemicals that can minimize surface treating problems caused by acid flowbacks. The results show that the proper selection and use of acid additives and surface treating products can eliminate or significantly reduce costly upsets in oil- and water-treating systems. Data on individual acid additives that impact water and oil treating are also presented. The results of this work are currently being used to solve produced-water- and oil-treating problems on offshore and onshore facilities in and around the Gulf of Mexico by reduction of production losses resulting from acid-flowback-related problems; reduction of the use and cost of tanks and barges used to segregate acid flowbacks; and development of effective methodology to select acid and surface treating additives that have resulted in lower overall treating costs.« less

Chile, 1964-74: The Successes and Failures of Reformism

DTIC Science & Technology

1975-09-22

upon mining for a majur portion or government revenue, saddled with an agricultural system characterized by the inequities and inefficiencies of...the most votes Allende and Alessandri. The Alessandri forces , in a gambit to upset traditional practice and invalidate the election, attempted a...and Alknde’s contradictory "peaceful transition to socialism" bring the country to the brink of civil war, the Armed Forces decided to dispense with

Criticism in the Romantic Relationships of Individuals With Social Anxiety.

PubMed

Porter, Eliora; Chambless, Dianne L; Keefe, John R

2017-07-01

Social anxiety is associated with difficulties in intimate relationships. Because fear of negative evaluation is a cardinal feature of social anxiety disorder, perceived criticism and upset due to criticism from partners may play a significant role in socially anxious individuals' intimate relationships. In the present study, we examine associations between social anxiety and perceived, observed, and expressed criticism in interactions with romantic partners. In Study 1, we collected self-report data from 343 undergraduates and their romantic partners on social anxiety symptoms, perceived and expressed criticism, and upset due to criticism. One year later couples reported whether they were still in this relationship. Results showed that social anxiety was associated with being more critical of one's partner, and among women, being more upset by criticism from a partner. Social anxiety was not related to perceived criticism, nor did criticism variables predict relationship status at Time 2. In Study 2, undergraduate couples with a partner high (n = 26) or low (n = 26) in social anxiety completed a 10-minute, video-recorded problem-solving task. Both partners rated their perceived and expressed criticism and upset due to criticism following the interaction, and observers coded interactions for criticism. Results indicated that social anxiety was not significantly related to any of the criticism variables, but post hoc analyses cast doubts upon the external validity of the problem-solving task. Results are discussed in light of known difficulties with intimacy among individuals with social anxiety. Copyright © 2016. Published by Elsevier Ltd.

Charge collection and SEU mechanisms

NASA Astrophysics Data System (ADS)

Musseau, O.

1994-01-01

In the interaction of cosmic ions with microelectronic devices a dense electron-hole plasma is created along the ion track. Carriers are separated and transported by the electric field and under the action of the concentration gradient. The subsequent collection of these carriers induces a transient current at some electrical node of the device. This "ionocurrent" (single ion induced current) acts as any electrical perturbation in the device, propagating in the circuit and inducing failures. In bistable systems (registers, memories) the stored data can be upset. In clocked devices (microprocessors) the parasitic perturbation may propagate through the device to the outputs. This type of failure only effects the information, and do not degrade the functionally of the device. The purpose of this paper is to review the mechanisms of single event upset in microelectronic devices. Experimental and theoretical results are presented, and actual questions and problems are discussed. A brief introduction recalls the creation of the dense plasma of electron-hole pairs. The basic processes for charge collection in a simple np junction (drift and diffusion) are presented. The funneling-field effect is discussed and experimental results are compared to numerical simulations and semi-empirical models. Charge collection in actual microelectronic structures is then presented. Due to the parasitic elements, coupling effects are observed. Geometrical effects, in densely packed structures, results in multiple errors. Electronic couplings are due to the carriers in excess, acting as minority carriers, that trigger parasitic bipolar transistors. Single event upset of memory cells is discussed, based on numerical and experimental data. The main parameters for device characterization are presented. From the physical interpretation of charge collection mechanisms, the intrinsic sensitivity of various microelectronic technologies is determined and compared to experimental data. Scaling laws and future trends are finally discussed.

Single event effects and laser simulation studies

NASA Technical Reports Server (NTRS)

Kim, Q.; Schwartz, H.; Mccarty, K.; Coss, J.; Barnes, C.

1993-01-01

The single event upset (SEU) linear energy transfer threshold (LETTH) of radiation hardened 64K Static Random Access Memories (SRAM's) was measured with a picosecond pulsed dye laser system. These results were compared with standard heavy ion accelerator (Brookhaven National Laboratory (BNL)) measurements of the same SRAM's. With heavy ions, the LETTH of the Honeywell HC6364 was 27 MeV-sq cm/mg at 125 C compared with a value of 24 MeV-sq cm/mg obtained with the laser. In the case of the second type of 64K SRAM, the IBM640lCRH no upsets were observed at 125 C with the highest LET ions used at BNL. In contrast, the pulsed dye laser tests indicated a value of 90 MeV-sq cm/mg at room temperature for the SEU-hardened IBM SRAM. No latchups or multiple SEU's were observed on any of the SRAM's even under worst case conditions. The results of this study suggest that the laser can be used as an inexpensive laboratory SEU prescreen tool in certain cases.

The tracking performance of distributed recoverable flight control systems subject to high intensity radiated fields

NASA Astrophysics Data System (ADS)

Wang, Rui

It is known that high intensity radiated fields (HIRF) can produce upsets in digital electronics, and thereby degrade the performance of digital flight control systems. Such upsets, either from natural or man-made sources, can change data values on digital buses and memory and affect CPU instruction execution. HIRF environments are also known to trigger common-mode faults, affecting nearly-simultaneously multiple fault containment regions, and hence reducing the benefits of n-modular redundancy and other fault-tolerant computing techniques. Thus, it is important to develop models which describe the integration of the embedded digital system, where the control law is implemented, as well as the dynamics of the closed-loop system. In this dissertation, theoretical tools are presented to analyze the relationship between the design choices for a class of distributed recoverable computing platforms and the tracking performance degradation of a digital flight control system implemented on such a platform while operating in a HIRF environment. Specifically, a tractable hybrid performance model is developed for a digital flight control system implemented on a computing platform inspired largely by the NASA family of fault-tolerant, reconfigurable computer architectures known as SPIDER (scalable processor-independent design for enhanced reliability). The focus will be on the SPIDER implementation, which uses the computer communication system known as ROBUS-2 (reliable optical bus). A physical HIRF experiment was conducted at the NASA Langley Research Center in order to validate the theoretical tracking performance degradation predictions for a distributed Boeing 747 flight control system subject to a HIRF environment. An extrapolation of these results for scenarios that could not be physically tested is also presented.

Effect of water chemistry upsets on the dynamics of corrective reagent dosing systems at thermal power stations

NASA Astrophysics Data System (ADS)

Voronov, V. N.; Yegoshina, O. V.; Bolshakova, N. A.; Yarovoi, V. O.; Latt, Aie Min

2016-12-01

Typical disturbances in the dynamics of a corrective reagent dosing system under unsteady-state conditions during the unsatisfactory operation of a chemical control system with some water chemistry upsets at thermal and nuclear power stations are considered. An experimental setup representing a physical model for the water chemistry control system is described. The two disturbances, which are most frequently encountered in water chemistry control practice, such as a breakdown or shutdown of temperature compensation during pH measurement and an increase in the heat-transfer fluid flow rate, have been modeled in the process of study. The study of the effect produced by the response characteristics of chemical control analyzers on the operation of a reagent dosing system under unsteady-state conditions is important for the operative control of a water chemistry regime state. The effect of temperature compensation during pH measurement on the dynamics of an ammonia-dosing system in the manual and automatic cycle chemistry control modes has been studied. It has been demonstrated that the reading settling time of a pH meter in the manual ammonia- dosing mode grows with a breakdown in temperature compensation and a simultaneous increase in the temperature of a heat-transfer fluid sample. To improve the efficiency of water chemistry control, some systems for the quality control of a heat-transfer fluid by a chemical parameter with the obligatory compensation of a disturbance in its flow rate have been proposed for use. Experimental results will possibly differ from industrial data due to a great length of sampling lines. For this reason, corrective reagent dosing systems must be adapted to the conditions of a certain power-generating unit in the process of their implementation.

SINGLE EVENT EFFECTS TEST FACILITY AT OAK RIDGE NATIONAL LABORATORY

DOE Office of Scientific and Technical Information (OSTI.GOV)

Riemer, Bernie; Gallmeier, Franz X; Dominik, Laura J

2015-01-01

Increasing use of microelectronics of ever diminishing feature size in avionics systems has led to a growing Single Event Effects (SEE) susceptibility arising from the highly ionizing interactions of cosmic rays and solar particles. Single event effects caused by atmospheric radiation have been recognized in recent years as a design issue for avionics equipment and systems. To ensure a system meets all its safety and reliability requirements, SEE induced upsets and potential system failures need to be considered, including testing of the components and systems in a neutron beam. Testing of ICs and systems for use in radiation environments requiresmore » the utilization of highly advanced laboratory facilities that can run evaluations on microcircuits for the effects of radiation. This paper provides a background of the atmospheric radiation phenomenon and the resulting single event effects, including single event upset (SEU) and latch up conditions. A study investigating requirements for future single event effect irradiation test facilities and developing options at the Spallation Neutron Source (SNS) is summarized. The relatively new SNS with its 1.0 GeV proton beam, typical operation of 5000 h per year, expertise in spallation neutron sources, user program infrastructure, and decades of useful life ahead is well suited for hosting a world-class SEE test facility in North America. Emphasis was put on testing of large avionics systems while still providing tunable high flux irradiation conditions for component tests. Makers of ground-based systems would also be served well by these facilities. Three options are described; the most capable, flexible, and highest-test-capacity option is a new stand-alone target station using about one kW of proton beam power on a gas-cooled tungsten target, with dual test enclosures. Less expensive options are also described.« less

Single Event Effects Test Facility Options at the Oak Ridge National Laboratory

DOE Office of Scientific and Technical Information (OSTI.GOV)

Riemer, Bernie; Gallmeier, Franz X; Dominik, Laura J

2015-01-01

Increasing use of microelectronics of ever diminishing feature size in avionics systems has led to a growing Single Event Effects (SEE) susceptibility arising from the highly ionizing interactions of cosmic rays and solar particles. Single event effects caused by atmospheric radiation have been recognized in recent years as a design issue for avionics equipment and systems. To ensure a system meets all its safety and reliability requirements, SEE induced upsets and potential system failures need to be considered, including testing of the components and systems in a neutron beam. Testing of integrated circuits (ICs) and systems for use in radiationmore » environments requires the utilization of highly advanced laboratory facilities that can run evaluations on microcircuits for the effects of radiation. This paper provides a background of the atmospheric radiation phenomenon and the resulting single event effects, including single event upset (SEU) and latch up conditions. A study investigating requirements for future single event effect irradiation test facilities and developing options at the Spallation Neutron Source (SNS) is summarized. The relatively new SNS with its 1.0 GeV proton beam, typical operation of 5000 h per year, expertise in spallation neutron sources, user program infrastructure, and decades of useful life ahead is well suited for hosting a world-class SEE test facility in North America. Emphasis was put on testing of large avionics systems while still providing tunable high flux irradiation conditions for component tests. Makers of ground-based systems would also be served well by these facilities. Three options are described; the most capable, flexible, and highest-test-capacity option is a new stand-alone target station using about one kW of proton beam power on a gas-cooled tungsten target, with dual test enclosures. Less expensive options are also described.« less

SEU System Analysis: Not Just the Sum of All Parts

NASA Technical Reports Server (NTRS)

Berg, Melanie D.; Label, Kenneth

2014-01-01

Single event upset (SEU) analysis of complex systems is challenging. Currently, system SEU analysis is performed by component level partitioning and then either: the most dominant SEU cross-sections (SEUs) are used in system error rate calculations; or the partition SEUs are summed to eventually obtain a system error rate. In many cases, system error rates are overestimated because these methods generally overlook system level derating factors. The problem with overestimating is that it can cause overdesign and consequently negatively affect the following: cost, schedule, functionality, and validation/verification. The scope of this presentation is to discuss the risks involved with our current scheme of SEU analysis for complex systems; and to provide alternative methods for improvement.

Characterization of a Recoverable Flight Control Computer System

NASA Technical Reports Server (NTRS)

Malekpour, Mahyar; Torres, Wilfredo

1999-01-01

The design and development of a Closed-Loop System to study and evaluate the performance of the Honeywell Recoverable Computer System (RCS) in electromagnetic environments (EME) is presented. The development of a Windows-based software package to handle the time-critical communication of data and commands between the RCS and flight simulation code in real-time while meeting the stringent hard deadlines is also submitted. The performance results of the RCS and characteristics of its upset recovery scheme while exercising flight control laws under ideal conditions as well as in the presence of electromagnetic fields are also discussed.

Analysis and Design of Ultra Wide-Band and High-Power Microwave Pulse Interactions With Electronic Circuits and Systems

DTIC Science & Technology

2007-02-28

upset, latch -up or failure of systems of digital components. A digital system can be in many different states, depending on its internal functioning...the Interface between Isorefractive Half-spaces A Y,A0 + B I (c). Cavity-Backed Gap in a Corner (d). A Right-Angle Isorefractive Wedge Structure z LL...ikjI I E2,:, (e) . A +-l l(ii (c). e Ca ity-Backedfraptive MatCoeria (d. BeRgt-Angl Isorefractive Wedge -Structur B V-T A.. D .F V-0 G x V-:x C E Y’-2

Upsets in Erased Floating Gate Cells With High-Energy Protons

DOE PAGES

Gerardin, S.; Bagatin, M.; Paccagnella, A.; ...

2017-01-01

We discuss upsets in erased floating gate cells, due to large threshold voltage shifts, using statistical distributions collected on a large number of memory cells. The spread in the neutral threshold voltage appears to be too low to quantitatively explain the experimental observations in terms of simple charge loss, at least in SLC devices. The possibility that memories exposed to high energy protons and heavy ions exhibit negative charge transfer between programmed and erased cells is investigated, although the analysis does not provide conclusive support to this hypothesis.

Mitigating Upsets in SRAM-Based FPGAs from the Xilinx Virtex 2 Family

NASA Technical Reports Server (NTRS)

Swift, G. M.; Yui, C. C.; Carmichael, C.; Koga, R.; George, J. S.

2003-01-01

Static random access memory (SRAM) upset rates in field programmable gate arrays (FPGAs) from the Xilinx Virtex 2 family have been tested for radiation effects on configuration memory, block RAM and the power-on-reset (POR) and SelectMAP single event functional interrupts (SEFIs). Dynamic testing has shown the effectiveness and value of Triple Module Redundancy (TMR) and partial reconfiguration when used in conjunction. Continuing dynamic testing for more complex designs and other Virtex 2 capabilities (i.e., I/O standards, digital clock managers (DCM), etc.) is scheduled.

Effects of cosmic rays on single event upsets

NASA Technical Reports Server (NTRS)

Venable, D. D.; Zajic, V.; Lowe, C. W.; Olidapupo, A.; Fogarty, T. N.

1989-01-01

Assistance was provided to the Brookhaven Single Event Upset (SEU) Test Facility. Computer codes were developed for fragmentation and secondary radiation affecting Very Large Scale Integration (VLSI) in space. A computer controlled CV (HP4192) test was developed for Terman analysis. Also developed were high speed parametric tests which are independent of operator judgment and a charge pumping technique for measurement of D(sub it) (E). The X-ray secondary effects, and parametric degradation as a function of dose rate were simulated. The SPICE simulation of static RAMs with various resistor filters was tested.

Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC Microprocessors

NASA Technical Reports Server (NTRS)

Irom, Farokh; Farmanesh, Farhad; Kouba, Coy K.

2006-01-01

Single-event upset effects from heavy ions are measured for Motorola silicon-on-insulator (SOI) microprocessor with 90 nm feature sizes. The results are compared with previous results for SOI microprocessors with feature sizes of 130 and 180 nm. The cross section of the 90 nm SOI processors is smaller than results for 130 and 180 nm counterparts, but the threshold is about the same. The scaling of the cross section with reduction of feature size and core voltage for SOI microprocessors is discussed.

Single Event Upset Rate Estimates for a 16-K CMOS (Complementary Metal Oxide Semiconductor) SRAM (Static Random Access Memory).

DTIC Science & Technology

1986-09-30

4 . ~**..ft.. ft . - - - ft SI TABLES 9 I. SA32~40 Single Event Upset Test, 1140-MeV Krypton, 9/l8/8~4. . .. .. .. .. .. .16 II. CRUP Simulation...cosmic ray interaction analysis described in the remainder of this report were calculated using the CRUP computer code 3 modified for funneling. The... CRUP code requires, as inputs, the size of a depletion region specified as a retangular parallel piped with dimensions a 9 b S c, the effective funnel

Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM

NASA Technical Reports Server (NTRS)

Chen, Dakai; Wilcox, Edward; Berg, Melanie; Kim, Hak; Phan, Anthony; Figueiredo, Marco; Seidleck, Christina; LaBel, Kenneth

2015-01-01

We investigated the heavy ion SEE characteristics of an EEPROM based on CBRAM technology. SEFI is the dominant type of SEE for each operating mode (standby, read-only, write/read). We also observed single bit upsets in the CBRAM cell, during write/read tests. the SEULET threshold is between 10 and 20 MeV * sq cm/mg, with an upper fluence limit of 3 × 10(exp 6) cm(exp -2) at 10 MeV * sq cm/mg. In the stand by mode, the CBRAM array appears immune to bit upsets.

Entry flight control system downmoding evaluation

NASA Technical Reports Server (NTRS)

Barnes, H. A.

1978-01-01

A method to desensitize the entry flight control system to structural vibration feedback which might induce an oscillatory instability is described. Trends in vehicle response and handling characteristics as a function of gain combinations in the FCS forward and rate feedback loops were described as observed in a man-in-the-loop simulation. Among the flight conditions considered are the effects of downmoding with APU failures, off-nominal trajectory conditions, sensed angle of attack errors, the impact on RCS fuel consumption, performance in the presence of aero variations, recovery from large FCS upsets, and default gains.

Coping styles of adolescents experiencing multiple forms of discrimination and bullying: evidence from a sample of ethnically diverse urban youth.

PubMed

Garnett, Bernice R; Masyn, Katherine E; Austin, S Bryn; Williams, David R; Viswanath, Kasisomayajula

2015-02-01

We used a latent class analysis (LCA) to characterize coping styles of urban youth and examined if coping styles moderated the association between experiencing discrimination and bullying and depressive symptoms. The data come from the 2006 Boston Youth Survey, where students were asked to select 2 behaviors they do most often when they are upset, from a list of 15 options. A total of 927 (75%) students contributed to the LCA analytic sample (44% non-Hispanic Blacks, 29% Hispanics, and 58% girls). Relative and absolute fit indices determined the number of classes. An interaction term between types of discrimination and bullying experienced and coping style tested for moderation. The LCA revealed that a 3-class solution had the best fit (Lo-Mendell-Rubin likelihood ratio test, 4-class vs 3-class, p-value .12). The largest coping style class was characterized by high endorsement of distractive coping strategies (59%), the second class was characterized by using supportive coping strategies (27%), and the third class was characterized by using avoidance coping strategies (12%). We found a significant interaction between discrimination and coping style for depressive symptoms. The relationship between experiencing discrimination and depression varied based on coping style and the type of discrimination and bullying experienced. © 2015, American School Health Association.

Evaluation of engineering plastic for rollover protective structure (ROPS) mounting.

PubMed

Comer, R S; Ayers, P D; Liu, J

2007-04-01

Agriculture has one of the highest fatality rates of any industry in America. Tractor rollovers are a significant contributor to the high death rate. Rollover protective structures (ROPS) have helped lower these high fatality rates on full-size tractors. However, a large number of older tractors still do not use ROPS due to the difficulty of designing and creating a mounting structure. To help reduce this difficulty, engineering plastics were evaluated for use in a ROPS mounting structure on older tractors. The use of engineering plastics around axle housings could provide a uniform mounting configuration as well as lower costs for aftermarket ROPS. Various plastics were examined through shear testing, scale model testing, and compressive strength testing. Once a material was chosen based upon strength and cost, full-scale testing of the plastic's strength on axle housings was conducted. Finally, a mounting structure was tested in static ROPS tests, and field upset tests were performed in accordance with SAE Standard J2194. Initial tests revealed that the ROPS mounting structure and axle housing combination had higher torsional strength with less twisting than the axle housing alone. An engineering plastic ROPS mounting structure was easily successful in withstanding the forces applied during the static longitudinal and lateral ROPS tests. Field upset testing revealed that the mounting structure could withstand the impact loads seen during actual upsets without a failure. During both static testing and field upset testing, no permanent twisting of the mounting structure was found. Engineering plastic could therefore be a viable option for a universal ROPS mounting structure for older tractors.

Symptoms Associated with Dietary Fiber Supplementation over Time in Individuals with Fecal Incontinence

PubMed Central

Bliss, Donna Z.; Savik, Kay; Jung, Hans-Joachim G.; Whitebird, Robin; Lowry, Ann

2011-01-01

Background Knowledge about adverse symptoms over time from fiber supplementation is lacking. Purpose To compare the severity of adverse gastrointestinal (GI) symptoms during supplementation with dietary fiber or placebo over time in adults with fecal incontinence. Secondary aims were to determine the relationship between symptom severity and emotional upset and their association with study attrition and reducing fiber dose. Methods Subjects (N=189, 77% female, 92% white, (age = 58 years, SD = 14) with fecal incontinence were randomly assigned to placebo or a supplement of 16g total dietary fiber/day from one of three sources: gum arabic, psyllium, or carboxymethylcellulose. They reported GI symptoms daily during baseline (14 days), incremental fiber dosing (6 days), and two segments of steady full fiber dose (32 days total). Results Severity of symptoms in all groups was minimal. Adjusting for study segment and day, a greater feeling of fullness in the psyllium group was the only symptom that differed from symptoms in the placebo group. Odds of having greater severity of flatus, belching, fullness, and bloating were 1.2–2.0 times greater in the steady dose segment compared to baseline. There was a positive association between symptom severity and emotional upset. Subjects with a greater feeling of fullness or bloating or higher scores for total symptom severity or emotional upset were more likely to withdraw from the study sooner or reduce fiber dose. Conclusions Persons with fecal incontinence experience a variety of GI symptoms over time. Symptom severity and emotional upset appear to influence fiber tolerance and study attrition. Supplements seemed well tolerated. PMID:21543963

Prediction of error rates in dose-imprinted memories on board CRRES by two different methods. [Combined Release and Radiation Effects Satellite

NASA Technical Reports Server (NTRS)

Brucker, G. J.; Stassinopoulos, E. G.

1991-01-01

An analysis of the expected space radiation effects on the single event upset (SEU) properties of CMOS/bulk memories onboard the Combined Release and Radiation Effects Satellite (CRRES) is presented. Dose-imprint data from ground test irradiations of identical devices are applied to the predictions of cosmic-ray-induced space upset rates in the memories onboard the spacecraft. The calculations take into account the effect of total dose on the SEU sensitivity of the devices as the dose accumulates in orbit. Estimates of error rates, which involved an arbitrary selection of a single pair of threshold linear energy transfer (LET) and asymptotic cross-section values, were compared to the results of an integration over the cross-section curves versus LET. The integration gave lower upset rates than the use of the selected values of the SEU parameters. Since the integration approach is more accurate and eliminates the need for an arbitrary definition of threshold LET and asymptotic cross section, it is recommended for all error rate predictions where experimental sigma-versus-LET curves are available.

The Single Event Effect Characteristics of the 486-DX4 Microprocessor

NASA Technical Reports Server (NTRS)

Kouba, Coy; Choi, Gwan

1996-01-01

This research describes the development of an experimental radiation testing environment to investigate the single event effect (SEE) susceptibility of the 486-DX4 microprocessor. SEE effects are caused by radiation particles that disrupt the logic state of an operating semiconductor, and include single event upsets (SEU) and single event latchup (SEL). The relevance of this work can be applied directly to digital devices that are used in spaceflight computer systems. The 486-DX4 is a powerful commercial microprocessor that is currently under consideration for use in several spaceflight systems. As part of its selection process, it must be rigorously tested to determine its overall reliability in the space environment, including its radiation susceptibility. The goal of this research is to experimentally test and characterize the single event effects of the 486-DX4 microprocessor using a cyclotron facility as the fault-injection source. The test philosophy is to focus on the "operational susceptibility," by executing real software and monitoring for errors while the device is under irradiation. This research encompasses both experimental and analytical techniques, and yields a characterization of the 486-DX4's behavior for different operating modes. Additionally, the test methodology can accommodate a wide range of digital devices, such as microprocessors, microcontrollers, ASICS, and memory modules, for future testing. The goals were achieved by testing with three heavy-ion species to provide different linear energy transfer rates, and a total of six microprocessor parts were tested from two different vendors. A consistent set of error modes were identified that indicate the manner in which the errors were detected in the processor. The upset cross-section curves were calculated for each error mode, and the SEU threshold and saturation levels were identified for each processor. Results show a distinct difference in the upset rate for different configurations of the on-chip cache, as well as proving that one vendor is superior to the other in terms of latchup susceptibility. Results from this testing were also used to provide a mean-time-between-failure estimate of the 486-DX4 operating in the radiation environment for the International Space Station.

Single-event upset in highly scaled commercial silicon-on-insulator PowerPc microprocessors

NASA Technical Reports Server (NTRS)

Irom, Farokh; Farmanesh, Farhad H.

2004-01-01

Single event upset effects from heavy ions are measured for Motorola and IBM silicon-on-insulator (SOI) microprocessors with different feature sizes, and core voltages. The results are compared with results for similar devices with build substrates. The cross sections of the SOI processors are lower than their bulk counterparts, but the threshold is about the same, even though the charge collections depth is more than an order of magnitude smaller in the SOI devices. The scaling of the cross section with reduction of feature size and core voltage dependence for SOI microprocessors discussed.

Simulation of SEU Cross-sections using MRED under Conditions of Limited Device Information

NASA Technical Reports Server (NTRS)

Lauenstein, J. M.; Reed, R. A.; Weller, R. A.; Mendenhall, M. H.; Warren, K. M.; Pellish, J. A.; Schrimpf, R. D.; Sierawski, B. D.; Massengill, L. W.; Dodd, P. E.;

Student perceptions of clinical mistreatment.

PubMed

Moreno, M; White, E D; Flores, M E; Riethmayer, J

2001-01-01

This study examined radiography students' perceptions regarding mistreatment during the clinical portion of their education. Results suggest that a majority of students perceived mistreatment and that second-year students were 4 times more likely to perceive mistreatment than first-year students. Most students who perceived mistreatment indicated that the abuse was verbal and came primarily from staff technologists. Most perceived the mistreatment to be slightly important and slightly upsetting. However, approximately one third perceived the mistreatment to be very important and very upsetting. As part of the study, students were asked to suggest preventive measures that could help eradicate abusive behavior in the clinical setting.

High performance static latches with complete single event upset immunity

DOEpatents

Corbett, Wayne T.; Weaver, Harry T.

1994-01-01

An asymmetric response latch providing immunity to single event upset without loss of speed. The latch has cross-coupled inverters having a hardened logic state and a soft state, wherein the logic state of the first inverter can only be changed when the voltage on the coupling node of that inverter is low and the logic state of the second inverter can only be changed when the coupling of that inverter is high. One of more of the asymmetric response latches may be configured into a memory cell having complete immunity, which protects information rather than logic states.

Test report for single event effects of the 80386DX microprocessor

NASA Technical Reports Server (NTRS)

Watson, R. Kevin; Schwartz, Harvey R.; Nichols, Donald K.

1993-01-01

The Jet Propulsion Laboratory Section 514 Single Event Effects (SEE) Testing and Analysis Group has performed a series of SEE tests of certain strategic registers of Intel's 80386DX CHMOS 4 microprocessor. Following a summary of the test techniques and hardware used to gather the data, we present the SEE heavy ion and proton test results. We also describe the registers tested, along with a system impact analysis should these registers experience a single event upset.

Modeling and Simulation of Upset-Inducing Disturbances for Digital Systems in an Electromagnetic Reverberation Chamber

NASA Technical Reports Server (NTRS)

Torres-Pomales, Wilfredo

2014-01-01

This report describes a modeling and simulation approach for disturbance patterns representative of the environment experienced by a digital system in an electromagnetic reverberation chamber. The disturbance is modeled by a multi-variate statistical distribution based on empirical observations. Extended versions of the Rejection Samping and Inverse Transform Sampling techniques are developed to generate multi-variate random samples of the disturbance. The results show that Inverse Transform Sampling returns samples with higher fidelity relative to the empirical distribution. This work is part of an ongoing effort to develop a resilience assessment methodology for complex safety-critical distributed systems.

Pre-attack symptomatology and temperament as predictors of children's responses to the September 11 terrorist attacks.

PubMed

Lengua, Liliana J; Long, Anna C; Smith, Kimberlee I; Meltzoff, Andrew N

2005-06-01

The aims of this study were to assess the psychological response of children following the September 11, 2001 terrorist attacks in New York and Washington, DC and to examine prospective predictors of children's post-attack responses. Children's responses were assessed in a community sample of children in Seattle, Washington, participating in an ongoing study. Symptomatology and temperament assessed prior to the attacks were examined as prospective predictors of post-attack post-traumatic stress (PTS), anxiety, depression and externalizing problems. Children demonstrated PTS symptoms and worries at levels comparable to those in children directly experiencing disasters, with 77% of children reporting being worried, 68% being upset by reminders, and 39% having upsetting thoughts. The most common PTS symptom cluster was re-experiencing, and 8% of children met criteria consistent with PTSD. African-American children reported more avoidant PTS symptoms and being more upset by the attacks than European-American children. Girls reported being more upset than boys. Prior internalizing, externalizing, social competence and self-esteem were related to post-attack PTS; and child inhibitory control, assessed prior to the 9/11 attacks, demonstrated a trend towards an association with post-attack PTS symptoms controlling for prior levels of symptomatology. PTS predicted child-report anxiety and conduct problem symptoms at follow-up, approximately 6 months after 9/11. Children experiencing a major disaster at a distance or indirectly through media exposure demonstrated worries and PTS symptoms suggesting that communities need to attend to children's mental health needs in response to national or regional disasters. Pre-disaster symptomatology or low self-regulation may render children more vulnerable in response to a disaster, and immediate post-disaster responses predict subsequent symptomatology. These variables might be used in the identification of children in need of intervention.

Radiation Testing, Characterization and Qualification Challenges for Modern Microelectronics and Photonics Devices and Technologies

NASA Technical Reports Server (NTRS)

LaBel, Kenneth A.; Cohn, Lewis M.

2008-01-01

At GOMAC 2007, we discussed a selection of the challenges for radiation testing of modern semiconductor devices focusing on state-of-the-art memory technologies. This included FLASH non-volatile memories (NVMs) and synchronous dynamic random access memories (SDRAMs). In this presentation, we extend this discussion in device packaging and complexity as well as single event upset (SEU) mechanisms using several technology areas as examples including: system-on-a-chip (SOC) devices and photonic or fiber optic systems. The underlying goal is intended to provoke thought for understanding the limitations and interpretation of radiation testing results.

A machine independent expert system for diagnosing environmentally induced spacecraft anomalies

NASA Technical Reports Server (NTRS)

Rolincik, Mark J.

1991-01-01

A new rule-based, machine independent analytical tool for diagnosing spacecraft anomalies, the EnviroNET expert system, was developed. Expert systems provide an effective method for storing knowledge, allow computers to sift through large amounts of data pinpointing significant parts, and most importantly, use heuristics in addition to algorithms which allow approximate reasoning and inference, and the ability to attack problems not rigidly defines. The EviroNET expert system knowledge base currently contains over two hundred rules, and links to databases which include past environmental data, satellite data, and previous known anomalies. The environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose.

Radiation-Hardened Electronics for Advanced Communications Systems

NASA Technical Reports Server (NTRS)

Whitaker, Sterling

2015-01-01

Novel approach enables high-speed special-purpose processors Advanced reconfigurable and reprogrammable communication systems will require sub-130-nanometer electronics. Legacy single event upset (SEU) radiation-tolerant circuits are ineffective at speeds greater than 125 megahertz. In Phase I of this project, ICs, LLC, demonstrated new base-level logic circuits that provide SEU immunity for sub-130-nanometer high-speed circuits. In Phase II, the company developed an innovative self-restoring logic (SRL) circuit and a system approach that provides high-speed, SEU-tolerant solutions that are effective for sub-130-nanometer electronics scalable to at least 22-nanometer processes. The SRL system can be used in the design of NASA's next-generation special-purpose processors, especially reconfigurable communication processors.

Bradycardia and Hypothermia Complicating Azithromycin Treatment.

PubMed

Benn, Kerri; Salman, Sam; Page-Sharp, Madhu; Davis, Timothy M E; Buttery, Jim P

2017-08-11

BACKGROUND Azithromycin is a macrolide antibiotic widely used to treat respiratory, urogenital, and other infections. Gastrointestinal upset, headache, and dizziness are common adverse effects, and prolongation of the rate-corrected electrocardiographic QT interval and malignant arrhythmias have been reported. There are rare reports of bradycardia and hypothermia but not in the same patient. CASE REPORT A 4-year-old boy given intravenous azithromycin as part of treatment for febrile neutropenia complicating leukemia chemotherapy developed hypothermia (rectal temperature 35.2°C) and bradycardia (65 beats/minute) after the second dose, which resolved over several days post-treatment, consistent with persistence of high tissue azithromycin concentrations relative to those in plasma. A sigmoid Emax pharmacokinetic/pharmacodynamic model suggested a maximal azithromycin-associated reduction in heart rate of 23 beats/minute. Monitoring for these potential adverse effects should facilitate appropriate supportive care in similar cases. CONCLUSIONS Recommended azithromycin doses can cause at least moderate bradycardia and hypothermia in vulnerable pediatric patients, adverse effects that should prompt appropriate monitoring and which may take many days to resolve.

Well-being as a moving target: measurement equivalence of the Bradburn Affect Balance Scale.

PubMed

Maitland, S B; Dixon, R A; Hultsch, D F; Hertzog, C

2001-03-01

Although the Bradburn Affect Balance scale (ABS) is a frequently used two-factor indicator of well-being in later life, its measurement and invariance properties are not well documented. We examined these issues using confirmatory factor analyses of cross-sectional (adults ages 54-87 years) and longitudinal data from the Victoria Longitudinal Study. Stability of the positive and negative affect factors was moderate across a 3-year period. Overall, factor loadings for positive affect items were invariant over time with the exception of the pleased item. Negative affect items were time invariant. However, age-group comparisons between young-old and old-old groups revealed age differences in loadings for the upset item at Time 1. Finally, gender groups differed in loadings for the top of the world and going your way items. Thus a pattern of partial measurement equivalence characterized item response to the ABS. Our results suggest that group comparisons and longitudinal change in ABS scale scores of positive and negative affect should be interpreted with caution.

The trouble with teething--misdiagnosis and misuse of a topical medicament.

PubMed

Wilson, P H R; Mason, C

2002-05-01

For many clinicians and parents "teething" remains a convenient diagnosis to explain all manner of local and systemic upset in the young child. Many therapies are on the market to help alleviate the symptoms of primary tooth eruption. In this article we highlight the problems of "teething" as a diagnosis by presenting a case where an initial misdiagnosis of teething compromised a patient's life. The same patient then suffered from topical analgesic misuse during the recovery period.

Method and apparatus for increasing resistance of bipolar buried layer integrated circuit devices to single-event upsets

NASA Technical Reports Server (NTRS)

Zoutendyk, John A. (Inventor)

1991-01-01

Bipolar transistors fabricated in separate buried layers of an integrated circuit chip are electrically isolated with a built-in potential barrier established by doping the buried layer with a polarity opposite doping in the chip substrate. To increase the resistance of the bipolar transistors to single-event upsets due to ionized particle radiation, the substrate is biased relative to the buried layer with an external bias voltage selected to offset the built-in potential just enough (typically between about +0.1 to +0.2 volt) to prevent an accumulation of charge in the buried-layer-substrate junction.

Error analysis and prevention of cosmic ion-induced soft errors in static CMOS RAMs

NASA Astrophysics Data System (ADS)

Diehl, S. E.; Ochoa, A., Jr.; Dressendorfer, P. V.; Koga, P.; Kolasinski, W. A.

1982-12-01

Cosmic ray interactions with memory cells are known to cause temporary, random, bit errors in some designs. The sensitivity of polysilicon gate CMOS static RAM designs to logic upset by impinging ions has been studied using computer simulations and experimental heavy ion bombardment. Results of the simulations are confirmed by experimental upset cross-section data. Analytical models have been extended to determine and evaluate design modifications which reduce memory cell sensitivity to cosmic ions. A simple design modification, the addition of decoupling resistance in the feedback path, is shown to produce static RAMs immune to cosmic ray-induced bit errors.

Gastrointestinal upsets associated with ingestion of copper-contaminated water.

PubMed Central

Knobeloch, L; Ziarnik, M; Howard, J; Theis, B; Farmer, D; Anderson, H; Proctor, M

1994-01-01

During 1992 and 1993 the Wisconsin Division of Health investigated five cases in which copper-contaminated drinking water was suspected of causing gastrointestinal upsets. Each of these case studies was conducted after our office was notified of high copper levels in drinking water or notified of unexplained illnesses. Our findings suggest that drinking water that contains copper at levels above the federal action limit of 1.3 mg/l may be a relatively common cause of diarrhea, abdominal cramps, and nausea. These symptoms occurred most frequently in infants and young children and among resident of newly constructed or renovated homes. Images p958-a PMID:9738210

Single-Event Upset (SEU) model verification and threshold determination using heavy ions in a bipolar static RAM

NASA Technical Reports Server (NTRS)

Zoutendyk, J. A.; Smith, L. S.; Soli, G. A.; Thieberger, P.; Wegner, H. E.

1985-01-01

Single-Event Upset (SEU) response of a bipolar low-power Schottky-diode-clamped TTL static RAM has been observed using Br ions in the 100-240 MeV energy range and O ions in the 20-100 MeV range. These data complete the experimental verification of circuit-simulation SEU modeling for this device. The threshold for onset of SEU has been observed by the variation of energy, ion species and angle of incidence. The results obtained from the computer circuit-simulation modeling and experimental model verification demonstrate a viable methodology for modeling SEU in bipolar integrated circuits.

High performance static latches with complete single event upset immunity

DOEpatents

Corbett, W.T.; Weaver, H.T.

1994-04-26

An asymmetric response latch providing immunity to single event upset without loss of speed is described. The latch has cross-coupled inverters having a hardened logic state and a soft state, wherein the logic state of the first inverter can only be changed when the voltage on the coupling node of that inverter is low and the logic state of the second inverter can only be changed when the coupling of that inverter is high. One of more of the asymmetric response latches may be configured into a memory cell having complete immunity, which protects information rather than logic states. 5 figures.

Family violence and football: the effect of unexpected emotional cues on violent behavior.

PubMed

Card, David; Dahl, Gordon B

2011-01-01

We study the link between family violence and the emotional cues associated with wins and losses by professional football teams. We hypothesize that the risk of violence is affected by the “gain-loss” utility of game outcomes around a rationally expected reference point. Our empirical analysis uses police reports of violent incidents on Sundays during the professional football season. Controlling for the pregame point spread and the size of the local viewing audience, we find that upset losses (defeats when the home team was predicted to win by four or more points) lead to a 10% increase in the rate of at-home violence by men against their wives and girlfriends. In contrast, losses when the game was expected to be close have small and insignificant effects. Upset wins (victories when the home team was predicted to lose) also have little impact on violence, consistent with asymmetry in the gain-loss utility function. The rise in violence after an upset loss is concentrated in a narrow time window near the end of the game and is larger for more important games. We find no evidence for reference point updating based on the halftime score.

Family Violence and Football: The Effect of Unexpected Emotional Cues on Violent Behavior*

PubMed Central

Card, David; Dahl, Gordon B.

2013-01-01

We study the link between family violence and the emotional cues associated with wins and losses by local professional football teams. We hypothesize that the risk of violence is affected by the ‘gain-loss’ utility of game outcomes around a rationally expected reference point. Our empirical analysis uses police reports of violent incidents on Sundays during the professional football season. Controlling for the pre-game point spread and the size of the local viewing audience, we find that upset losses (defeats when the home team was predicted to win by 4 or more points) lead to a 10 percent increase in the rate of at-home violence by men against their wives and girlfriends. In contrast, losses when the game was expected to be close have small and insignificant effects. Upset wins (when the home team was predicted to lose) also have little impact on violence, consistent with asymmetry in the gain-loss utility function. The rise in violence after an upset loss is concentrated in a narrow time window near the end of the game, and is larger for more important games. We find no evidence for reference point updating based on the halftime score. PMID:21853617

Particle sensor array

NASA Technical Reports Server (NTRS)

Buehler, Martin G. (Inventor); Blaes, Brent R. (Inventor); Lieneweg, Udo (Inventor)

1994-01-01

A particle sensor array which in a preferred embodiment comprises a static random access memory having a plurality of ion-sensitive memory cells, each such cell comprising at least one pull-down field effect transistor having a sensitive drain surface area (such as by bloating) and at least one pull-up field effect transistor having a source connected to an offset voltage. The sensitive drain surface area and the offset voltage are selected for memory cell upset by incident ions such as alpha-particles. The static random access memory of the present invention provides a means for selectively biasing the memory cells into the same state in which each of the sensitive drain surface areas is reverse biased and then selectively reducing the reversed bias on these sensitive drain surface areas for increasing the upset sensitivity of the cells to ions. The resulting selectively sensitive memory cells can be used in a number of applications. By way of example, the present invention can be used for measuring the linear energy transfer of ion particles, as well as a device for assessing the resistance of CMOS latches to Cosmic Ray induced single event upsets. The sensor of the present invention can also be used to determine the uniformity of an ion beam.

A Physics-Based Engineering Approach to Predict the Cross Section for Advanced SRAMs

NASA Astrophysics Data System (ADS)

Li, Lei; Zhou, Wanting; Liu, Huihua

2012-12-01

This paper presents a physics-based engineering approach to estimate the heavy ion induced upset cross section for 6T SRAM cells from layout and technology parameters. The new approach calculates the effects of radiation with junction photocurrent, which is derived based on device physics. The new and simple approach handles the problem by using simple SPICE simulations. At first, the approach uses a standard SPICE program on a typical PC to predict the SPICE-simulated curve of the collected charge vs. its affected distance from the drain-body junction with the derived junction photocurrent. And then, the SPICE-simulated curve is used to calculate the heavy ion induced upset cross section with a simple model, which considers that the SEU cross section of a SRAM cell is more related to a “radius of influence” around a heavy ion strike than to the physical size of a diffusion node in the layout for advanced SRAMs in nano-scale process technologies. The calculated upset cross section based on this method is in good agreement with the test results for 6T SRAM cells processed using 90 nm process technology.

Simulation Study of Flap Effects on a Commercial Transport Airplane in Upset Conditions

NASA Technical Reports Server (NTRS)

Cunningham, Kevin; Foster, John V.; Shah, Gautam H.; Stewart, Eric C.; Ventura, Robin N.; Rivers, Robert A.; Wilborn, James E.; Gato, William

2005-01-01

As part of NASA's Aviation Safety and Security Program, a simulation study of a twinjet transport airplane crew training simulation was conducted to address fidelity for upset or loss of control conditions and to study the effect of flap configuration in those regimes. Piloted and desktop simulations were used to compare the baseline crew training simulation model with an enhanced aerodynamic model that was developed for high-angle-of-attack conditions. These studies were conducted with various flap configurations and addressed the approach-to-stall, stall, and post-stall flight regimes. The enhanced simulation model showed that flap configuration had a significant effect on the character of departures that occurred during post-stall flight. Preliminary comparisons with flight test data indicate that the enhanced model is a significant improvement over the baseline. Some of the unrepresentative characteristics that are predicted by the baseline crew training simulation for flight in the post-stall regime have been identified. This paper presents preliminary results of this simulation study and discusses key issues regarding predicted flight dynamics characteristics during extreme upset and loss-of-control flight conditions with different flap configurations.

The Development of Lightweight Commercial Vehicle Wheels Using Microalloying Steel

NASA Astrophysics Data System (ADS)

Lu, Hongzhou; Zhang, Lilong; Wang, Jiegong; Xuan, Zhaozhi; Liu, Xiandong; Guo, Aimin; Wang, Wenjun; Lu, Guimin

Lightweight wheels can reduce weight about 100kg for commercial vehicles, and it can save energy and reduce emission, what's more, it can enhance the profits for logistics companies. The development of lightweight commercial vehicle wheels is achieved by the development of new steel for rim, the process optimization of flash butt welding, and structure optimization by finite element methods. Niobium micro-alloying technology can improve hole expansion rate, weldability and fatigue performance of wheel steel, and based on Niobium micro-alloying technology, a special wheel steel has been studied whose microstructure are Ferrite and Bainite, with high formability and high fatigue performance, and stable mechanical properties. The content of Nb in this new steel is 0.025% and the hole expansion rate is ≥ 100%. At the same time, welding parameters including electric upsetting time, upset allowance, upsetting pressure and flash allowance are optimized, and by CAE analysis, an optimized structure has been attained. As a results, the weight of 22.5in×8.25in wheel is up to 31.5kg, which is most lightweight comparing the same size wheels. And its functions including bending fatigue performance and radial fatigue performance meet the application requirements of truck makers and logistics companies.

Piloted Simulator Evaluation Results of Flight Physics Based Stall Recovery Guidance

NASA Technical Reports Server (NTRS)

Lombaerts, Thomas; Schuet, Stefan; Stepanyan, Vahram; Kaneshige, John; Hardy, Gordon; Shish, Kimberlee; Robinson, Peter

2018-01-01

In recent studies, it has been observed that loss of control in flight is the most frequent primary cause of accidents. A significant share of accidents in this category can be remedied by upset prevention if possible, and by upset recovery if necessary, in this order of priorities. One of the most important upsets to be recovered from is stall. Recent accidents have shown that a correct stall recovery maneuver remains a big challenge in civil aviation, partly due to a lack of pilot training. A possible strategy to support the flight crew in this demanding context is calculating a recovery guidance signal, and showing this signal in an intuitive way on one of the cockpit displays, for example by means of the flight director. Different methods for calculating the recovery signal, one based on fast model predictive control and another using an energy based approach, have been evaluated in four relevant operational scenarios by experienced commercial as well as test pilots in the Vertical Motion Simulator at NASA Ames Research Center. Evaluation results show that this approach could be able to assist the pilots in executing a correct stall recovery maneuver.

Weekly vs. daily administration of oral methotrexate (MTX) for generalized plaque psoriasis: a randomized controlled clinical trial.

PubMed

Radmanesh, Mohammad; Rafiei, Behnam; Moosavi, Zahra-Beigum; Sina, Niloofar

2011-10-01

Methotrexate (MTX) treatment for psoriasis is most often administered weekly, because the drug has been considered more hepatotoxic when taken daily. However, some patients may tolerate smaller, more frequent doses better. To study the efficacy and toxicity of daily vs. weekly MTX. In a randomized controlled trial, 101 patients with generalized plaque psoriasis received oral MTX 2.5 mg daily for weeks, 4 weeks and monthly for a total of 4 months. Changes in PASI scores were classified into three categories: >75% improvement was considered significant; 25-75% moderate; and <25% poor. Sixty Group 1 patients and 81 Group 2 patients showed a significant response (P-value 0.001); 19 patients in Group 1 and 14 in Group 2 responded moderately; 22 patients in Group 1 and six patients from Group 2 responded poorly. Forty-five patients in Group 1 and 33 in Group 2 developed transient increases in liver enzymes (P-value 0.11). Nausea, headache, fatigue, and gastrointestinal upset were noted in four Group 1 patients and 30 Group 2 patients (P-value 0.0001). Nausea, vomiting, headache, and fatigue were significantly less common side effects in our patients who received MTX daily, but liver enzyme abnormalities were less common, and clinical efficacy was greater in the patients who received MTX weekly. © 2011 The International Society of Dermatology.

Stochastic Stability of Sampled Data Systems with a Jump Linear Controller

NASA Technical Reports Server (NTRS)

Gonzalez, Oscar R.; Herencia-Zapana, Heber; Gray, W. Steven

2004-01-01

In this paper an equivalence between the stochastic stability of a sampled-data system and its associated discrete-time representation is established. The sampled-data system consists of a deterministic, linear, time-invariant, continuous-time plant and a stochastic, linear, time-invariant, discrete-time, jump linear controller. The jump linear controller models computer systems and communication networks that are subject to stochastic upsets or disruptions. This sampled-data model has been used in the analysis and design of fault-tolerant systems and computer-control systems with random communication delays without taking into account the inter-sample response. This paper shows that the known equivalence between the stability of a deterministic sampled-data system and the associated discrete-time representation holds even in a stochastic framework.

A New Partial Reconfiguration-Based Fault-Injection System to Evaluate SEU Effects in SRAM-Based FPGAs

NASA Astrophysics Data System (ADS)

Sterpone, L.; Violante, M.

2007-08-01

Modern SRAM-based field programmable gate array (FPGA) devices offer high capability in implementing complex system. Unfortunately, SRAM-based FPGAs are extremely sensitive to single event upsets (SEUs) induced by radiation particles. In order to successfully deploy safety- or mission-critical applications, designer need to validate the correctness of the obtained designs. In this paper we describe a system based on partial-reconfiguration for running fault-injection experiments within the configuration memory of SRAM-based FPGAs. The proposed fault-injection system uses the internal configuration capabilities that modern FPGAs offer in order to inject SEU within the configuration memory. Detailed experimental results show that the technique is orders of magnitude faster than previously proposed ones.

Single event upsets in semiconductor devices induced by highly ionising particles.

PubMed

Sannikov, A V

2004-01-01

A new model of single event upsets (SEUs), created in memory cells by heavy ions and high energy hadrons, has been developed. The model takes into account the spatial distribution of charge collection efficiency over the cell area not considered in previous approaches. Three-dimensional calculations made by the HADRON code have shown good agreement with experimental data for the energy dependence of proton SEU cross sections, sensitive depths and other SEU observables. The model is promising for prediction of SEU rates for memory chips exposed in space and in high-energy experiments as well as for the development of a high-energy neutron dosemeter based on the SEU effect.

A guideline for heavy ion radiation testing for Single Event Upset (SEU)

NASA Technical Reports Server (NTRS)

Nichols, D. K.; Price, W. E.; Malone, C.

1984-01-01

A guideline for heavy ion radiation testing for single event upset was prepared to assist new experimenters in preparing and directing tests. How to estimate parts vulnerability and select an irradiation facility is described. A broad brush description of JPL equipment is given, certain necessary pre-test procedures are outlined and the roles and testing guidelines for on-site test personnel are indicated. Detailed descriptions of equipment needed to interface with JPL test crew and equipment are not provided, nor does it meet the more generalized and broader requirements of a MIL-STD document. A detailed equipment description is available upon request, and a MIL-STD document is in the early stages of preparation.

NASA Space Engineering Research Center for VLSI systems design

NASA Technical Reports Server (NTRS)

1991-01-01

This annual review reports the center's activities and findings on very large scale integration (VLSI) systems design for 1990, including project status, financial support, publications, the NASA Space Engineering Research Center (SERC) Symposium on VLSI Design, research results, and outreach programs. Processor chips completed or under development are listed. Research results summarized include a design technique to harden complementary metal oxide semiconductors (CMOS) memory circuits against single event upset (SEU); improved circuit design procedures; and advances in computer aided design (CAD), communications, computer architectures, and reliability design. Also described is a high school teacher program that exposes teachers to the fundamentals of digital logic design.

Space System Survivability

NASA Astrophysics Data System (ADS)

Kuller, W. G.; Hanifen, D. W.

1982-07-01

Exoatmospheric detonations of nuclear weapons produce a broad spectrum of effects which can prevent operational space missions from being successfully accomplished. The spacecraft may be exposed to the prompt radiation from the detonations which can cause upset or burnout of critical mission components through Transient Radiation Effects on Electronics (TREE) or System Generated Electromagnetic Pulse (SGEMP). Continual exposure to the trapped radiation environment may cause component failure due to total dose or Electron Caused EMP (ECEMP). Satellite links to ground and airborne terminals are subject to serious degradation due to signal absorption and scintillation. The ground data stations and lines of communications are subject to failure from the broad range effects of high-altitude EMP.

Estimate of radiation damage to low-level electronics of the RF system in the LHC cavities arising from beam gas collisions.

PubMed

Butterworth, A; Ferrari, A; Tsoulou, E; Vlachoudis, V; Wijnands, T

2005-01-01

Monte Carlo simulations have been performed to estimate the radiation damage induced by high-energy hadrons in the digital electronics of the RF low-level systems in the LHC cavities. High-energy hadrons are generated when the proton beams interact with the residual gas. The contributions from various elements-vacuum chambers, cryogenic cavities, wideband pickups and cryomodule beam tubes-have been considered individually, with each contribution depending on the gas composition and density. The probability of displacement damage and single event effects (mainly single event upsets) is derived for the LHC start-up conditions.

Method and apparatus for forming flues on tubular stock

DOEpatents

Beck, D.E.; Carson, C.

1979-12-21

The present invention is directed to a die mechanism utilized for forming flues on long, relatively narrow tubular stock. These flues are formed by displacing a die from within the tubular stock through perforations previously drilled through the tubular stock at selected locations. The drawing of the die upsets the material to form the flue of the desired configuration. The die is provided with a lubricating system which enables the lubricant to be dispensed uniformly about the entire periphery of the die in contact with the material being upset so as to assure the formation of the flues. Further, the lubricant is dispensed from within the die onto the peripheral surface of the latter at pressures in the range of about 2000 to 10,000 psi so as to assure the adequate lubrication of the die during the drawing operation. By injecting the lubricant at such high pressures, low viscosity liquid, such as water and/or alcohol, may be efficiently used as a lubricant and also provides a mechanism by which the lubricant may be evaporated from the surface of the flues at ambient conditions so as to negate the cleansing operations previously required prior to joining the flues to other conduit mechanisms by fusion welding and the like.

SEE induced in SRAM operating in a superconducting electron linear accelerator environment

NASA Astrophysics Data System (ADS)

Makowski, D.; Mukherjee, Bhaskar; Grecki, M.; Simrock, Stefan

2005-02-01

Strong fields of bremsstrahlung photons and photoneutrons are produced during the operation of high-energy electron linacs. Therefore, a mixed gamma and neutron radiation field dominates the accelerators environment. The gamma radiation induced Total Ionizing Dose (TID) effect manifests the long-term deterioration of the electronic devices operating in accelerator environment. On the other hand, the neutron radiation is responsible for Single Event Effects (SEE) and may cause a temporal loss of functionality of electronic systems. This phenomenon is known as Single Event Upset (SEU). The neutron dose (KERMA) was used to scale the neutron induced SEU in the SRAM chips. Hence, in order to estimate the neutron KERMA conversion factor for Silicon (Si), dedicated calibration experiments using an Americium-Beryllium (241Am/Be) neutron standard source was carried out. Single Event Upset (SEU) influences the short-term operation of SRAM compared to the gamma induced TID effect. We are at present investigating the feasibility of an SRAM based real-time beam-loss monitor for high-energy accelerators utilizing the SEU caused by fast neutrons. This paper highlights the effects of gamma and neutron radiations on Static Random Access Memory (SRAM), placed at selected locations near the Superconducting Linear Accelerator driving the Vacuum UV Free Electron Laser (VUVFEL) of DESY.

Assessment of densification and mechanical property of AISI 8630 steel composition on different heat treatments produced through hot upsetting powder preform forging

NASA Astrophysics Data System (ADS)

Bala, Y. G.; Sankaranarayanan, S. Raman; Pandey, K. S.

2015-11-01

The present investigation was carried out to evaluate the densification, mechanical properties, microstructural and fractrography effects of AISI 8630 steel composition developed through powder preform forging under different heat treated conditions. Sintered preforms of different aspect ratios such as 0.6, 0.9, and 1.2 were hot upset forged to disc shape to different height strain to analysis the densification mechanism. Certain relationships relating strains, Poisson's ratio relating densification have revealed the effect of preform geometry on densification kinetics and resulted in the polynomial expression with justified regression coefficient greater the 0.9 or unity. The preforms of aspect ratio of 1.1 were hot upset forged to square cross section bars and transferred to different quenching medium like oil, water, furnace and air to assess its mechanical properties. Comparing the temperament of the heat treatments, sintered forged homogenised water quenched sample upshot in the maximum Tensile strength with least per centage elongation andthe furnace cooled sample shows the maximum toughness with desirable per centage elongation and least tensile strength. Microstructure stated the presence of varying ferrite and pearlite distribution and fractograph studies has disclosed the mixed mode of failure on the effect of varying heat treatments progression has affected the properties significantly.

Reactions to Participating in Intimate Partner Violence and Minority Stress Research: A Mixed Methodological Study of Self-Identified Lesbian and Gay Emerging Adults.

PubMed

Edwards, Katie M; Sylaska, Kateryna M

2016-01-01

The purpose of this study was to examine lesbian and gay (LG) young adults' reactions to participating in intimate partner violence (IPV) and minority stress research using a mixed methodological design. Participants were 277 U.S. college students currently involved in same-sex relationships and self-identified cisgender LG who completed an online questionnaire that included closed- and open-ended questions. Results suggested that IPV research was well tolerated by the vast majority of participants; close to one in 10 participants reported being upset by the study questions, yet 75% of upset individuals reported some level of personal benefit. Reasons for upset as identified in the open-ended responses included thinking about personal experiences with IPV, as the perpetrator or friend of a victim, as well as thinking about the uncertainty of their future with their current partner. The correlates of emotional reactions and personal benefits to research participation were also examined, and these varied among gay men and lesbian women. Implications of these findings underscore the importance of accurate reflection of risk and benefits in informed consent documents as well as systematic evaluation of sexual minority participants' reactions to research participation in an effort to conduct ethically sound sexual science research.

40 CFR 403.16 - Upset provision.

Code of Federal Regulations, 2010 CFR

2010-07-01

... operational error, improperly designed treatment facilities, inadequate treatment facilities, lack of... usual exercise of prosecutorial discretion, Agency enforcement personnel should review any claims that...

Notice of Violation of IEEE Publication PrinciplesJoint Redundant Residue Number Systems and Module Isolation for Mitigating Single Event Multiple Bit Upsets in Datapath

NASA Astrophysics Data System (ADS)

Li, Lei; Hu, Jianhao

2010-12-01

Notice of Violation of IEEE Publication Principles"Joint Redundant Residue Number Systems and Module Isolation for Mitigating Single Event Multiple Bit Upsets in Datapath"by Lei Li and Jianhao Hu,in the IEEE Transactions on Nuclear Science, vol.57, no.6, Dec. 2010, pp. 3779-3786After careful and considered review of the content and authorship of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE's Publication Principles.This paper contains substantial duplication of original text from the paper cited below. The original text was copied without attribution (including appropriate references to the original author(s) and/or paper title) and without permission.Due to the nature of this violation, reasonable effort should be made to remove all past references to this paper, and future references should be made to the following articles:"Multiple Error Detection and Correction Based on Redundant Residue Number Systems"by Vik Tor Goh and M.U. Siddiqi,in the IEEE Transactions on Communications, vol.56, no.3, March 2008, pp.325-330"A Coding Theory Approach to Error Control in Redundant Residue Number Systems. I: Theory and Single Error Correction"by H. Krishna, K-Y. Lin, and J-D. Sun, in the IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol.39, no.1, Jan 1992, pp.8-17In this paper, we propose a joint scheme which combines redundant residue number systems (RRNS) with module isolation (MI) for mitigating single event multiple bit upsets (SEMBUs) in datapath. The proposed hardening scheme employs redundant residues to improve the fault tolerance for datapath and module spacings to guarantee that SEMBUs caused by charge sharing do not propagate among the operation channels of different moduli. The features of RRNS, such as independence, parallel and error correction, are exploited to establish the radiation hardening architecture for the datapath in radiation environments. In the proposed scheme, all of the residues can be processed independently, and most of the soft errors in datapath can be corrected with the redundant relationship of the residues at correction module, which is allocated at the end of the datapath. In the back-end implementation, module isolation technique is used to improve the soft error rate performance for RRNS by physically separating the operation channels of different moduli. The case studies show at least an order of magnitude decrease on the soft error rate (SER) as compared to the NonRHBD designs, and demonstrate that RRNS+MI can reduce the SER from 10-12 to 10-17 when the processing steps of datapath are 106. The proposed scheme can even achieve less area and latency overheads than that without radiation hardening, since RRNS can reduce the operational complexity in datapath.

Non-radiation hardened microprocessors in space-based remote sensing systems

NASA Astrophysics Data System (ADS)

DeCoursey, R.; Melton, Ryan; Estes, Robert R., Jr.

2006-09-01

The CALIPSO (Cloud-Aerosol Lidar and Infrared Pathfinder Satellite Observations) mission is a comprehensive suite of active and passive sensors including a 20Hz 230mj Nd:YAG lidar, a visible wavelength Earth-looking camera and an imaging infrared radiometer. CALIPSO flies in formation with the Earth Observing System Post-Meridian (EOS PM) train, provides continuous, near-simultaneous measurements and is a planned 3 year mission. CALIPSO was launched into a 98 degree sun synchronous Earth orbit in April of 2006 to study clouds and aerosols and acquires over 5 gigabytes of data every 24 hours. Figure 1 shows the ground track of one CALIPSO orbit as well as high and low intensity South Atlantic Anomaly outlines. CALIPSO passes through the SAA several times each day. Spaced based remote sensing systems that include multiple instruments and/or instruments such as lidar generate large volumes of data and require robust real-time hardware and software mechanisms and high throughput processors. Due to onboard storage restrictions and telemetry downlink limitations these systems must pre-process and reduce the data before sending it to the ground. This onboard processing and realtime requirement load may mean that newer more powerful processors are needed even though acceptable radiation-hardened versions have not yet been released. CALIPSO's single board computer payload controller processor is actually a set of four (4) voting non-radiation hardened COTS Power PC 603r's built on a single width VME card by General Dynamics Advanced Information Systems (GDAIS). Significant radiation concerns for CALIPSO and other Low Earth Orbit (LEO) satellites include the South Atlantic Anomaly (SAA), the north and south poles and strong solar events. Over much of South America and extending into the South Atlantic Ocean (see figure 1) the Van Allen radiation belts dip to just 200-800km and spacecraft entering this area are subjected to high energy protons and experience higher than normal Single Event Upset (SEU) and Single Event Latch-up (SEL) rates. Although less significant, spacecraft flying in the area around the poles experience similar upsets. Finally, powerful solar proton events in the range of 10MeV/10pfu to 100MeV/1pfu as are forecasted and tracked by NOAA's Space Environment Center in Colorado can result in SingleEvent Upset (SEU), Single Event Latch-up (SEL) and permanent failures such as Single Event Gate Rupture (SEGR) in some technologies. (Galactic Cosmic Rays (GCRs) are another source, especially for gate rupture) CALIPSO mitigates common radiation concerns in its data handling through the use of redundant processors, radiation-hardened Application Specific Integrated Circuits (ASIC), hardware-based Error Detection and Correction (EDAC), processor and memory scrubbing, redundant boot code and mirrored files. After presenting a system overview this paper will expand on each of these strategies. Where applicable, related on-orbit data collected since the CALIPSO initial boot on May 4, 2006 will be noted.

Non Radiation Hardened Microprocessors in Spaced Based Remote Sensing Systems

NASA Technical Reports Server (NTRS)

Decoursey, Robert J.; Estes, Robert F.; Melton, Ryan

2006-01-01

The CALIPSO (Cloud-Aerosol Lidar and Infrared Pathfinder Satellite Observations) mission is a comprehensive suite of active and passive sensors including a 20Hz 230mj Nd:YAG lidar, a visible wavelength Earth-looking camera and an imaging infrared radiometer. CALIPSO flies in formation with the Earth Observing System Post-Meridian (EOS PM) train, provides continuous, near-simultaneous measurements and is a planned 3 year mission. CALIPSO was launched into a 98 degree sun synchronous Earth orbit in April of 2006 to study clouds and aerosols and acquires over 5 gigabytes of data every 24 hours. The ground track of one CALIPSO orbit as well as high and low intensity South Atlantic Anomaly outlines is shown. CALIPSO passes through the SAA several times each day. Spaced based remote sensing systems that include multiple instruments and/or instruments such as lidar generate large volumes of data and require robust real-time hardware and software mechanisms and high throughput processors. Due to onboard storage restrictions and telemetry downlink limitations these systems must pre-process and reduce the data before sending it to the ground. This onboard processing and realtime requirement load may mean that newer more powerful processors are needed even though acceptable radiation-hardened versions have not yet been released. CALIPSO's single board computer payload controller processor is actually a set of four (4) voting non-radiation hardened COTS Power PC 603r's built on a single width VME card by General Dynamics Advanced Information Systems (GDAIS). Significant radiation concerns for CALIPSO and other Low Earth Orbit (LEO) satellites include the South Atlantic Anomaly (SAA), the north and south poles and strong solar events. Over much of South America and extending into the South Atlantic Ocean the Van Allen radiation belts dip to just 200-800km and spacecraft entering this area are subjected to high energy protons and experience higher than normal Single Event Upset (SEU) and Single Event Latch-up (SEL) rates. Although less significant, spacecraft flying in the area around the poles experience similar upsets. Finally, powerful solar proton events in the range of 10MeV/10pfu to 100MeV/1pfu as are forecasted and tracked by NOAA's Space Environment Center in Colorado can result in Single Event Upset (SEU), Single Event Latch-up (SEL) and permanent failures such as Single Event Gate Rupture (SEGR) in some technologies. (Galactic Cosmic Rays (GCRs) are another source, especially for gate rupture) CALIPSO mitigates common radiation concerns in its data handling through the use of redundant processors, radiation-hardened Application Specific Integrated Circuits (ASIC), hardware-based Error Detection and Correction (EDAC), processor and memory scrubbing, redundant boot code and mirrored files. After presenting a system overview this paper will expand on each of these strategies. Where applicable, related on-orbit data collected since the CALIPSO initial boot on May 4, 2006 will be noted.

The effects of heavy ion radiation on digital micromirror device performance

NASA Astrophysics Data System (ADS)

Travinsky, Anton; Vorobiev, Dmitry; Ninkov, Zoran; Raisanen, Alan D.; Pellish, Jonathan A.; Robberto, Massimo; Heap, Sara

2016-07-01

There is a pressing need in the astronomical community for space-suitable multi-object spectrometers (MOSs). Several digital micromirror device (DMD)-based prototype MOSs have been developed for ground-based observatories; however, their main use will come with deployment on a space based mission. Therefore, performance of DMDs under exoatmospheric radiation needs to be evaluated. In our previous work we demonstrated that DMDs are tolerant to heavy ion irradiation in general and calculated upset rate of 4.3 micromirrors in 24 hours in orbit for 1-megapixel device. The goal of this additional experiment was to acquire more data and therefore increase the accuracy of the predicted in-orbit micromirror upset rate. Similar to the previous experiment, for this testing 0.7 XGA DMDs were re-windowed with 2 μm thick pellicle and tested under accelerated heavy-ion radiation (with control electronics shielded from radiation) with a focus on detection of single-event upsets (SEUs). We concentrated on ions with low levels of linear energy transfer (LET) 1.8 - 13 MeV•cm2•mg-1 to cover the most critical range of the Weibull curve for those devices. As during the previous experiment, we observed and documented non-destructive heavy ion-induced micromirror state changes. All SEUs were always cleared with a soft reset (that is, sending a new pattern to the device). The DMDs we tested did not experience single-event induced permanent damage or functional changes that required a hard reset (power cycle), even at high ion fluences. Based on the data obtained in the experiments we predict micromirror in-orbit upset rate of 5.6 micromirrors in 24 hours in-orbit for the tested devices. This suggests that the heavy-ion induced SEU rate burden for a DMD-based instrument will be manageable when exposed to solar particle fluxes and cosmic rays in orbit.

International Aerospace and Ground Conference on Lightning and Static Electricity (ICOLSE) (10th) and the Congres International Aeronautiq (17th) Held in Paris (France) on 10-13 June 1985

DTIC Science & Technology

1985-06-13

reelles de foudroiement et comparer ensuite les reponses obtenues ä celles issues de la simulation au sol, qui laisse subsister un doute quant a sa...but not be limited to, the follow- ing I tens: a) Management control b) Lightning zone identification c) Lightning coirpo.ient identification d...critical roles in functions such as stores management and fly-by-wire systems. Therefore, a great concern arises for preventing upset of these

Dicyclomine

MedlinePlus

... tract by blocking the activity of a certain natural substance in the body. ... dry mouth upset stomach vomiting constipation stomach pain gas or bloating loss of appetite dizziness tingling headache ...

Heavy-ion induced single-event upset in integrated circuits

NASA Technical Reports Server (NTRS)

Zoutendyk, J. A.

1991-01-01

The cosmic ray environment in space can affect the operation of Integrated Circuit (IC) devices via the phenomenon of Single Event Upset (SEU). In particular, heavy ions passing through an IC can induce sufficient integrated current (charge) to alter the state of a bistable circuit, for example a memory cell. The SEU effect is studied in great detail in both static and dynamic memory devices, as well as microprocessors fabricated from bipolar, Complementary Metal Oxide Semiconductor (CMOS) and N channel Metal Oxide Semiconductor (NMOS) technologies. Each device/process reflects its individual characteristics (minimum scale geometry/process parameters) via a unique response to the direct ionization of electron hole pairs by heavy ion tracks. A summary of these analytical and experimental SEU investigations is presented.

Saw Palmetto Berry as a Treatment for BPH

PubMed Central

Fagelman, Elliot; Lowe, Franklin C

2001-01-01

Phytotherapeutic agents are often prescribed in Europe for the treatment of benign prostatic hyperplasia with lower urinary tract symptoms and are commonly used in the United States in over-the-counter preparations. Saw palmetto berry is the most popular of these agents, and in vitro some studies suggest that liposterolic extract of the plant has antiandrogenic effects that inhibit the type 1 and type 2 isoenzymes of 5α-reductase; however there are no clinical studies that show any decrease in serum dihydrotestosterone or prostate-specific antigen. Its efficacy in the treatment of lower urinary tract symptoms has not been conclusively proven. Clinical efficacy was suggested by a meta-analysis of Permixon, a formulation of saw palmetto, but the meta-analysis was done on suboptimal studies. One trial supports the equivalency of Permixon to finasteride in treating moderate to severe symptoms of benign prostatic hyperplasia, with less decrease in sexual function. However, without a control/placebo arm, the actual efficacy of the agents cannot be determined. Other than occasional gastrointestinal upset, no other side effects have been reported. PMID:16985705

Space station trace contaminant control

NASA Technical Reports Server (NTRS)

Olcutt, T.

1985-01-01

Different systems for the control of space station trace contaminants are outlined. The issues discussed include: spacecabin contaminant sources, technology base, contaminant control system elements and configuration, approach to contaminant control, contaminant load model definition, spacecraft maximum allowable concentrations, charcoal bed sizing and performance characteristics, catalytic oxidizer sizing and performance characteristics, special sorbent bed sizing, animal and plant research payload problems, and emergency upset contaminant removal. It is concluded that the trace contaminant control technology base is firm, the necessary hardware tools are available, and the previous design philosophy is still applicable. Some concerns are the need as opposed to danger of the catalytic oxidizer, contaminants with very low allowable concentrations, and the impact of relaxing materials requirements.

Space life support engineering program

NASA Technical Reports Server (NTRS)

Seagrave, Richard C.

1992-01-01

A comprehensive study to develop software to simulate the dynamic operation of water reclamation systems in long-term closed-loop life support systems is being carried out as part of an overall program for the design of systems for a moon station or a Mars voyage. This project is being done in parallel with a similar effort in the Department of Chemistry to develop durable accurate low-cost sensors for monitoring of trace chemical and biological species in recycled water supplies. Aspen-Plus software is being used on a group of high-performance work stations to develop the steady state descriptions for a number of existing technologies. Following completion, a dynamic simulation package will be developed for determining the response of such systems to changes in the metabolic needs of the crew and to upsets in system hardware performance.

Overview of HPM Effects in Electronics

DOE Office of Scientific and Technical Information (OSTI.GOV)

Holloway, Michael A.

2012-06-04

The following presentation contains an overview of HPM effects in modern electronics. HPM effects can be categorized into two basic level of effects, which are damaging and non-damaging. Damaging effects include junction breakdowns, dielectric breakdowns, and latch-up. These types of effects render a system inoperable until repaired. With non-damaging effects, HPM signals couple to into system components generating circuit responses that can overwhelm normal operation. Non-damaging effects can temporarily render a system inoperable or cause a system to lock and require a restart. Since modern systems are so complex, fundamental mechanisms of upset in circuit primitives are studied. All topicsmore » covered and all figured contained within are found in open literature. All data plots presented were obtained from experimental measurements conducted at the University of Maryland College Park and are also found in the open literature.« less

A strong pinning model for the coercivity of die-upset Pr-Fe-B magnets

NASA Astrophysics Data System (ADS)

Pinkerton, F. E.; fürst, C. D.

1991-04-01

We have measured the temperature dependence of the intrinsic coercivity Hci(T) between 5 and 565 K in a die-upset Pr-Fe-B magnet. Over a very wide temperature range up to 477 K, Hci(T) is in excellent agreement with a model for strong domain-wall pinning by a random array of pinning sites proposed by Gaunt [P. Gaunt, Philos. Mag. B 48, 261 (1983)]. The model includes both the temperature dependence of the intrinsic magnetic properties of the Pr2Fe14B phase and the effects of thermal activation of domain walls over the pinning barrier. The pinning sites are modeled as nonmagnetic planar inhomogeneities at the boundaries between platelet-shaped Pr2Fe14B grains. We develop an expression for the maximum pinning force per site, f, and derive the model prediction that (Hci/γHA)1/2 varies linearly with (T/γ)2/3, where HA and γ are the magnetocrystalline anisotropy field and the domain-wall energy per unit area of the Pr2Fe14B phase, respectively. Significant deviations from the model are observed only at high temperature, suggesting that the strong pinning model is no longer valid very close to the Curie temperature (565 K). The present result agrees with the model fit obtained for a die-upset Nd-Fe-B magnet.

Indinavir

MedlinePlus

... meals, with water, skim or nonfat milk, juice, coffee, or tea. However, if indinavir upsets your stomach, ... medications, or any of the ingredients in indinavir capsules. Ask your pharmacist for a list of the ...

HypsIRI On-Board Science Data Processing

NASA Technical Reports Server (NTRS)

Flatley, Tom

2010-01-01

Topics include On-board science data processing, on-board image processing, software upset mitigation, on-board data reduction, on-board 'VSWIR" products, HyspIRI demonstration testbed, and processor comparison.

Chemical Principls Exemplified

ERIC Educational Resources Information Center

Plumb, Robert C.

1973-01-01

Two topics are discussed: (1) Stomach Upset Caused by Aspirin, illustrating principles of acid-base equilibrium and solubility; (2) Physical Chemistry of the Drinking Duck, illustrating principles of phase equilibria and thermodynamics. (DF)

High School Youth's Reactions to Participating in Mixed-Methodological Dating Violence Research.

PubMed

Edwards, Katie M; Haynes, Ellen E; Rodenhizer-Stämpfli, Kara Anne

2016-07-01

The present study used a sample of high school youth (N = 218) and a mixed-methodological research design to examine high school students' reactions to participating in focus groups and completing surveys that inquired about dating violence (DV). Results showed that showed that 1.5% (n = 3) of the youth regretted participating in the study and 6% (n = 12) were upset by the study questions; being upset was attributed to personal experiences with DV and being disturbed by peers' responses during the focus group. Furthermore, 49% (n = 99) of the youth reported feeling that they personally benefited from participating in the study for reasons such as learning ways to help friends in situations of DV. Results have implications for conducting mixed-methodological DV research with youth. © The Author(s) 2016.

An Examination of Environment Perturbation Effects on Single Event Upset Rates

NASA Technical Reports Server (NTRS)

Gates, Michele M.; Leidecker, Henning W.; Lewis, Mark J.

1997-01-01

This paper presents an analysis of the sensitivity of single event upset (SEU) rate predictions to changes in the direct ionization-inducing environment. An examination based on the nature of the SEU rate equation is presented for the case in which the perturbation is constant across varying particle linear energy transfer (LET). It is shown that the relative variation in SEU rate is equal to the relative perturbation in flux. Results are also presented for the case in which the environment perturbations exist in small LET bins. Through this analysis it is shown that the relative variation in expected SEU rate is equal to that in flux only for the LET regime in which the product of the cross section and differential flux is maximum.

Ultrasonic angle beam standard reflector. [ultrasonic nondestructive inspection

NASA Technical Reports Server (NTRS)

Berry, R. F., Jr. (Inventor)

1985-01-01

A method that provides an impression profile in a reference standard material utilized in inspecting critically stressed components with pulsed ultrasound is described. A die stamp having an I letter is used to impress the surface of a reference material. The die stamp is placed against the surface and struck with an inertia imparting member to impress the I in the reference standard material. Upset may appear on the surface as a result of the impression and is removed to form a smooth surface. The stamping and upset removal is repeated until the entire surface area of a depth control platform on the die stamp uniformly contacts the material surface. The I impression profile in the reference standard material is utilized for reflecting pulsed ultrasonic beams for inspection purposes.

A flight investigation of the wake turbulence alleviation resulting from a flap configuration change on a B-747 aircraft

NASA Technical Reports Server (NTRS)

Jacobsen, R. A.; Short, B. J.

1977-01-01

A flight test investigation was conducted to evaluate the effects of a flap configuration change on the vortex wake characteristics of a Boeing 747 (B-747) aircraft as measured by differences in upset response resulting from deliberate vortex encounters by a following Learjet aircraft and by direct measurement of the velocities in the wake. The flaps of the B-747 have a predominant effect on the wake. The normal landing flap configuration produces a strong vortex that is attenuated when the outboard flap segments are raised; however, extension of the landing gear at that point increases the vortex induced upsets. These effects are in general agreement with existing wind tunnel and flight data for the modified flap configuration.

Evaluating the Upset Protrusion Joining (UPJ) Method to Join magnesium Castings to Dissimilar Metals

DOE Office of Scientific and Technical Information (OSTI.GOV)

Logan, Stephen D.

2015-08-19

This presentation discusses advantages and best practices for incorporating magnesium in automotive component applications to achieve substantial mass reduction, as well as some of the key challenges with respect to joining, coating, and galvanic corrosion, before providing an introduction and status update of the U.S. Department of Energy and Department of Defense jointly sponsored Upset Protrusion Joining (UPJ) process development and evaluation project. This update includes sharing performance results of a benchmark evaluation of the self-pierce riveting (SPR) process for joining dissimilar magnesium (Mg) to aluminum (Al) materials in four unique coating configurations before introducing the UPJ concept and comparingmore » performance results of the joints made with the UPJ process to those made with the SPR process.« less

Investigation of rolling variables on the structure of steel

NASA Astrophysics Data System (ADS)

Ekebuisi, Godwyn O.

The Literature pertaining to the present research has been critically reviewed. Hot deformation of Nb-free and Nb-containing stainless and C-Mn steels has been carried out by: upset-forging, rolling, and plane strain compression testing. Also, some gridded lead alloy and some mild steel containing Type I MnS inclusions as markers have been hot rolled. Subsequently investigations have been made into: barrelling and lubrication in upsetting; distributions of temperature and strain during thermomechanical working; microstructural processes associated with hot deformation of steel and the evolution of microstructures particularly recrystallised gamma-grain size; isothermal transformation of austenite to ferrite; and the mechanisms governing hot deformation of austenite.Barrelling during the hot upsetting of a solid cylinder arises from the combined effects of interface friction and inhomogeneous distribution of temperature. A barrelling factor, B[f], has been defined to quantify the degree of barrelling and hence of inhomogeneity of deformation in an upset-forged cylinder. Employing glass as a lubricant, an optimised lubrication technique, which ensures homogeneous deformation in upsetting, has been developed and a mechanism of lubrication proposed. The through-thickness temperature distribution of a deforming material, particularly during hot rolling, is inhomogeneous. Generally, the centre-plane temperature rises due to heat generation while the surface-plane temperature drops due to the cooling effects of the tools. Strain distribution during hot rolling is also inhomogeneous. In particular, the vertical strain (epsilon[z]) is minimum at the surface-plane of the material, maximum at the mid-plane and intermediate at the centre-plane.Hot deformation of the stainless steels leads to substructure formation and, at suitably high strains, dynamic and metadynamic recrystallisation. Only a small amount of static recovery precedes static recrystallisation. Nucleation for recrystallisation occurs at preferential sites, particularly serrated boundaries and triple junctions of the deformed prior gamma-grains.The nucleated gamma-grains grow anisotropically and link up to form chains of grains at the prior gamma-grain boundaries. Recrystallisation in hot-rolled samples is inhomogeneous at micro and macro-levels. Particularly, recrystallisation is accelerated at the centre-plane and retarded at the surface plane. This effect arises mainly from non-uniform distribution of temperature and is influenced by material and hot rolling variables. Nb retards recrystallisation by the combined effects of Nb carbide/ nitride particles and Nb atoms in solid solution, the particle effect predominating at 1100°C. Recrystallisation is accelerated by a higher strain, a higher deformation temperature, a higher strain rate, a decrease in the prior ?-grain size, and the presence of deformation bands and twins. A non-isothermal multiple deformation sequence increases the incubation time due to a large temperature drop but promotes a fast recrystallisation rate at the recrystallisation temperature. (Abstract shortened by ProQuest.).

Managing Adrenal Insufficiency

MedlinePlus

... replace cortisol; they are called glucocorticoids. At NIH, hydrocortisone, dexamethasone, or prednisone are usually recommended. If you ... side effects of these drugs? Replacement doses of hydrocortisone rarely cause side effects. Sometimes, an upset stomach ...

Chamomile

MedlinePlus

... anxiety, and gastrointestinal conditions such as upset stomach, gas, and diarrhea. It is also used topically for ... Review . 2007;28(4):e16-e18. German chamomile. Natural Medicines Web site. Accessed at naturalmedicines.therapeuticresearch.com/ ...

Depression (PDQ®)—Health Professional Version

Cancer.gov

Depression, secondary to stress and emotional upset, can occur in adults and children with cancer. Get comprehensive information about assessing depression in patients, interventions, and more in this summary for clinicians.

Single event test methodology for integrated optoelectronics

NASA Technical Reports Server (NTRS)

Label, Kenneth A.; Cooley, James A.; Stassinopoulos, E. G.; Marshall, Paul; Crabtree, Christina

1993-01-01

A single event upset (SEU), defined as a transient or glitch on the output of a device, and its applicability to integrated optoelectronics are discussed in the context of spacecraft design and the need for more than a bit error rate viewpoint for testing and analysis. A methodology for testing integrated optoelectronic receivers and transmitters for SEUs is presented, focusing on the actual test requirements and system schemes needed for integrated optoelectronic devices. Two main causes of single event effects in the space environment, including protons and galactic cosmic rays, are considered along with ground test facilities for simulating the space environment.

Develop and test fuel cell powered on-site integrated total energy systems. Phase 3: Full-scale power plant development

NASA Technical Reports Server (NTRS)

Kaufman, A.; Pudick, S.; Wang, C. L.; Werth, J.; Whelan, J. A.

1984-01-01

Two 25-cell, 13 inch x 23 inch (4kW) stacks were started up to evaluate the reliability of component and stack technology developed through the end of 1983. Both stacks started up well and are running satisfactorily on hydrogen-air after 1900 hours and 800 hours, respectively. A synthetic-reformat mixing station is nearing completion, and both stacks will be operated on reformate fuel. A stack-protection control system was placed in operation for Stack No. 2, and a similar set-up is in preparation for Stack No. 1. This system serves to change operating conditions or shut the stack down to avoid deleterious effects from nonstack-related upsets. The capability will greatly improve changes of obtaining meaningful long-term test data.

The influence of strain rate and the effect of friction on the forging load in simple upsetting and closed die forging

NASA Astrophysics Data System (ADS)

Klemz, Francis B.

Forging provides an elegant solution to the problem of producing complicated shapes from heated metal. This study attempts to relate some of the important parameters involved when considering, simple upsetting, closed die forging and extrusion forging.A literature survey showed some of the empirical graphical and statistical methods of load prediction together with analytical methods of estimating load and energy. Investigations of the effects of high strain rate and temperature on the stress-strain properties of materials are also evident.In the present study special equipment including an experimental drop hammer and various die-sets have been designed and manufactured. Instrumentation to measure load/time and displacement/time behaviour, of the deformed metal, has been incorporated and calibrated. A high speed camera was used to record the behaviour mode of test pieces used in the simple upsetting tests.Dynamic and quasi-static material properties for the test materials, lead and aluminium alloy, were measured using the drop-hammer and a compression-test machine.Analytically two separate mathematical solutions have been developed: A numerical technique using a lumped-massmodel for the analysis of simple upsetting and closed-die forging and, for extrusion forging, an analysis which equates the shear and compression energy requirements tothe work done by the forging load.Cylindrical test pieces were used for all the experiments and both dry and lubricated test conditions were investigated. The static and dynamic tests provide data on Load, Energy and the Profile of the deformed billet. In addition for the Extrusion Forging, both single ended and double ended tests were conducted. Material dependency was also examined by a further series of tests on aluminium and copper.Comparison of the experimental and theoretical results was made which shows clearly the effects of friction and high strain rate on load and energy requirements and the deformation mode of the billet. For the axisymmetric shapes considered, it was found that the load, energy requirement and profile could be predicted with reasonable accuracy.

Post-Traumatic Stress Disorder (PTSD)

MedlinePlus

... as if it were happening again (flashbacks) Upsetting dreams or nightmares about the traumatic event Severe emotional ... aspects of the traumatic event through play Frightening dreams that may or may not include aspects of ...

Changing your sleep habits

MedlinePlus

Insomnia - sleep habits; Sleep disorder - sleep habits; Problems falling asleep; Sleep hygiene ... People who have insomnia are often worried about getting enough sleep. The more they try to sleep, the more frustrated and upset they ...

Aluminum Hydroxide and Magnesium Hydroxide

MedlinePlus

Aluminum Hydroxide, Magnesium Hydroxide are antacids used together to relieve heartburn, acid indigestion, and upset stomach. They ... They combine with stomach acid and neutralize it. Aluminum Hydroxide, Magnesium Hydroxide are available without a prescription. ...

Diabetes - when you are sick

MedlinePlus

... gov/ency/patientinstructions/000079.htm Diabetes - when you are sick To use the sharing features on this ... call or see your provider. Eating When you are Sick When you have an upset stomach, try ...

Neutron Particle Effects on a Quad-Redundant Flight Control Computer

NASA Technical Reports Server (NTRS)

Eure, Kenneth; Belcastro, Celeste M.; Gray, W Steven; Gonzalex, Oscar

2003-01-01

This paper describes a single-event upset experiment performed at the Los Alamos National Laboratory. A closed-loop control system consisting of a Quad-Redundant Flight Control Computer (FCC) and a B737 simulator was operated while the FCC was exposed to a neutron beam. The purpose of this test was to analyze the effects of neutron bombardment on avionics control systems operating at altitudes where neutron strikes are probable. The neutron energy spectrum produced at the Los Alamos National Laboratory is similar in shape to the spectrum of atmospheric neutrons but much more intense. The higher intensity results in accelerated life tests that are representative of the actual neutron radiation that a FCC may receive over a period of years.

BRAT Diet: Recovering from an Upset Stomach

MedlinePlus

... A special diet known as the BRAT diet (Bananas, Rice, Applesauce, and Toast) is an effective way ... and has lost due to vomiting and diarrhea. Bananas, for example, are high in the vitamin potassium. ...

Staying Healthy While You Travel (For Parents)

MedlinePlus

... ear discomfort , travel (or motion) sickness, and diarrhea . Jet Lag When you fly across time zones, it ... for longer than usual. In addition to tiredness, jet lag can also cause an upset stomach and ...

Angular dependence of DRAM upset susceptibility

NASA Technical Reports Server (NTRS)

Guertin, S. M.; Swift, G. M.; Edmonds, L. D.

2000-01-01

Heavy ion irradiations of two types of commercial DRAMs reveal unexpected angular responses. One device's cross section varied by two orders of magnitude with azimuthal angle. Accurate prediction of space rates requires accommodating this effect.

A SEU-Hard Flip-Flop for Antifuse FPGAs

NASA Technical Reports Server (NTRS)

Katz, R.; Wang, J. J.; McCollum, J.; Cronquist, B.; Chan, R.; Yu, D.; Kleyner, I.; Day, John H. (Technical Monitor)

2001-01-01

A single event upset (SEU)-hardened flip-flop has been designed and developed for antifuse Field Programmable Gate Array (FPGA) application. Design and application issues, testability, test methods, simulation, and results are discussed.

Single-event effects in avionics

DOE Office of Scientific and Technical Information (OSTI.GOV)

Normand, E.

1996-04-01

The occurrence of single-event upset (SEU) in aircraft electronics has evolved from a series of interesting anecdotal incidents to accepted fact. A study completed in 1992 demonstrated that SEU`s are real, that the measured in-flight rates correlate with the atmospheric neutron flux, and that the rates can be calculated using laboratory SEU data. Once avionics DEU was shown to be an actual effect, it had to be dealt with in avionics designs. The major concern is in random access memories (RAM`s), both static (SRAM`s) and dynamic (DRAM`s), because these microelectronic devices contain the largest number of bits, but other parts,more » such as microprocessors, are also potentially susceptible to upset. In addition, other single-event effects (SEE`s), specifically latch-up and burnout, can also be induced by atmospheric neutrons.« less

Gender matters: Experiences and consequences of digital dating abuse victimization in adolescent dating relationships.

PubMed

Reed, Lauren A; Tolman, Richard M; Ward, L Monique

2017-08-01

Digital dating abuse (DDA) behaviors include the use of digital media to monitor, control, threaten, harass, pressure, or coerce a dating partner. In this study, 703 high school students reported on the frequency of DDA victimization, whether they were upset by these incidents, and how they responded. Results suggest that although both girls and boys experienced DDA at similar rates of frequency (with the exception of sexual coercion), girls reported that they were more upset by these behaviors. Girls also expressed more negative emotional responses to DDA victimization than boys. Although DDA is potentially harmful for all youth, gender matters. These findings suggest that the experience and consequences of DDA may be particularly detrimental for girls. Copyright © 2017 The Foundation for Professionals in Services for Adolescents. Published by Elsevier Ltd. All rights reserved.

Radiation Mitigation and Power Optimization Design Tools for Reconfigurable Hardware in Orbit

NASA Technical Reports Server (NTRS)

French, Matthew; Graham, Paul; Wirthlin, Michael; Wang, Li; Larchev, Gregory

2005-01-01

The Reconfigurable Hardware in Orbit (RHinO)project is focused on creating a set of design tools that facilitate and automate design techniques for reconfigurable computing in space, using SRAM-based field-programmable-gate-array (FPGA) technology. In the second year of the project, design tools that leverage an established FPGA design environment have been created to visualize and analyze an FPGA circuit for radiation weaknesses and power inefficiencies. For radiation, a single event Upset (SEU) emulator, persistence analysis tool, and a half-latch removal tool for Xilinx/Virtex-II devices have been created. Research is underway on a persistence mitigation tool and multiple bit upsets (MBU) studies. For power, synthesis level dynamic power visualization and analysis tools have been completed. Power optimization tools are under development and preliminary test results are positive.

Impact of Temporal Masking of Flip-Flop Upsets on Soft Error Rates of Sequential Circuits

NASA Astrophysics Data System (ADS)

Chen, R. M.; Mahatme, N. N.; Diggins, Z. J.; Wang, L.; Zhang, E. X.; Chen, Y. P.; Liu, Y. N.; Narasimham, B.; Witulski, A. F.; Bhuva, B. L.; Fleetwood, D. M.

2017-08-01

Reductions in single-event (SE) upset (SEU) rates for sequential circuits due to temporal masking effects are evaluated. The impacts of supply voltage, combinational-logic delay, flip-flop (FF) SEU performance, and particle linear energy transfer (LET) values are analyzed for SE cross sections of sequential circuits. Alpha particles and heavy ions with different LET values are used to characterize the circuits fabricated at the 40-nm bulk CMOS technology node. Experimental results show that increasing the delay of the logic circuit present between FFs and decreasing the supply voltage are two effective ways of reducing SE error rates for sequential circuits for particles with low LET values due to temporal masking. SEU-hardened FFs benefit less from temporal masking than conventional FFs. Circuit hardening implications for SEU-hardened and unhardened FFs are discussed.

Analysis of multiple cell upset sensitivity in bulk CMOS SRAM after neutron irradiation

NASA Astrophysics Data System (ADS)

Pan, Xiaoyu; Guo, Hongxia; Luo, Yinhong; Zhang, Fengqi; Ding, Lili

2018-03-01

In our previous studies, we have proved that neutron irradiation can decrease the single event latch-up (SEL) sensitivity of CMOS SRAM. And one of the key contributions to the multiple cell upset (MCU) is the parasitic bipolar amplification, it bring us to study the impact of neutron irradiation on the SRAM’s MCU sensitivity. After the neutron experiment, we test the devices’ function and electrical parameters. Then, we use the heavy ion fluence to examine the changes on the devices’ MCU sensitivity pre- and post-neutron-irradiation. Unfortunately, neutron irradiation makes the MCU phenomenon worse. Finally, we use the electric static discharge (ESD) testing technology to deduce the experimental results and find that the changes on the WPM region take the lead rather than the changes on the parasitic bipolar amplification for the 90 nm process.

High coercivity, anisotropic, heavy rare earth-free Nd-Fe-B by Flash Spark Plasma Sintering.

PubMed

Castle, Elinor; Sheridan, Richard; Zhou, Wei; Grasso, Salvatore; Walton, Allan; Reece, Michael J

2017-09-11

In the drive to reduce the critical Heavy Rare Earth (HRE) content of magnets for green technologies, HRE-free Nd-Fe-B has become an attractive option. HRE is added to Nd-Fe-B to enhance the high temperature performance of the magnets. To produce similar high temperature properties without HRE, a crystallographically textured nanoscale grain structure is ideal; and this conventionally requires expensive "die upset" processing routes. Here, a Flash Spark Plasma Sintering (FSPS) process has been applied to a Dy-free Nd 30.0 Fe 61.8 Co 5.8 Ga 0.6 Al 0.1 B 0.9 melt spun powder (MQU-F, neo Magnequench). Rapid sinter-forging of a green compact to near theoretical density was achieved during the 10 s process, and therefore represents a quick and efficient means of producing die-upset Nd-Fe-B material. The microstructure of the FSPS samples was investigated by SEM and TEM imaging, and the observations were used to guide the optimisation of the process. The most optimal sample is compared directly to commercially die-upset forged (MQIII-F) material made from the same MQU-F powder. It is shown that the grain size of the FSPS material is halved in comparison to the MQIII-F material, leading to a 14% increase in coercivity (1438 kA m -1 ) and matched remanence (1.16 T) giving a BH max of 230 kJ m -3 .

Virtex-II Pro PowerPC SEE Characterization Test Methods and Results

NASA Technical Reports Server (NTRS)

Petrick, David; Powell, Wesley; LaBel, Ken; Howard, James

2005-01-01

The Xilinx Vix-11 Pro is a platform FPGA that embeds multiple microprocessors within the fabric of an SRAM-based reprogrammable FPGA. The variety and quantity of resources provided by this family of devices make them very attractive for spaceflight applications. However,these devices will be susceptible to single event effects (SEE), which must be mitigated. Observations from prior testing of the Xilinx Virtex-II Pro suggest that the PowerPC core has significant vulnerability to SEES. However, these initial tests were not designed to exclusively target the functionality of the PowerPC, therefore making it difficult to distinguish processor upsets from fabric upsets. The main focus of this paper involves detailed SEE testing of the embedded PowerPC core. Due to the complexity of the PowerPC, various custom test applications, both static and dynamic, will be designed to isolate each Unit of the processor. Collective analysis of the test results will provide insight into the exact upset mechanism of the PowerPC. With this information, mitigations schemes can be developed and tested that address the specific susceptibilities of these devices. The test bed will be the Xilinx SEE Consortium Virtex-II Pro test board, which allows for configuration scrubbing, design triplication, and ease of data collection. Testing will be performed at the Indiana University Cyclotron Facility using protons of varying energy levels and fluencies. This paper will present the detailed test approach along with the results.

Effects of Cabin Upsets on Adsorption Columns for Air Revitalization

NASA Technical Reports Server (NTRS)

LeVan, M. Douglas

1999-01-01

The National Aeronautics and Space Administration (NASA) utilizes adsorption technology as part of contaminant removal systems designed for long term missions. A variety of trace contaminants can be effectively removed from gas streams by adsorption onto activated carbon. An activated carbon adsorption column meets NASA's requirements of a lightweight and efficient means of controlling trace contaminant levels aboard spacecraft and space stations. The activated carbon bed is part of the Trace Contaminant Control System (TCCS) which is utilized to purify the cabin atmosphere. TCCS designs oversize the adsorption columns to account for irregular fluctuations in cabin atmospheric conditions. Variations in the cabin atmosphere include changes in contaminant concentrations, temperature, and relative humidity. Excessively large deviations from typical conditions can result from unusual crew activity, equipment malfunctions, or even fires. The research carried out under this award focussed in detail on the effects of cabin upsets on the performance of activated carbon adsorption columns. Both experiments and modeling were performed with an emphasis on the roll of a change in relative humidity on adsorption of trace contaminants. A flow through fixed-bed apparatus was constructed at the NASA Ames Research Center, and experiments were performed there by W. Scot Appel under the direction of Dr. John E. Finn. Modeling work was performed at the University of Virginia and at Vanderbilt University by W. Scot Appel under the direction of M. Douglas LeVan. All three participants collaborated in all of the various phases of the research. The most comprehensive document describing the research is the Ph.D. dissertation of W. Scot Appel. Results have been published in several papers and presented in talks at technical conferences. All documents have been transmitted to Dr. John E. Finn.

A review of granisetron, 5-hydroxytryptamine3 receptor antagonists, and other antiemetics.

PubMed

Hsu, Eric S

2010-01-01

Nausea and vomiting are 2 of the most upsetting adverse reactions of chemotherapy. Current guidelines propose 5-hydroxytryptamine3 (5-HT3) receptor antagonists as a pharmacologic intervention for acute and delayed nausea and vomiting [chemotherapy-induced nausea and vomiting (CINV)] associated with moderately and highly emetogenic chemotherapy. Meanwhile, both postoperative nausea and vomiting (PONV) and postdischarge nausea and vomiting are challenging situations after surgeries and procedures. Prophylactic and therapeutic combinations of antiemetics are recommended in patients at high risk of suffering from PONV and postdischarge nausea and vomiting. Granisetron (Kytril) is a selective 5-HT3 receptor antagonist that does not induce or inhibit the hepatic cytochrome P-450 system in vitro. There are also 4 other antagonists of 5-HT3 receptor (dolasetron, ondansetron, palonosetron, and tropisetron) being metabolized via the CYP2D6 and are subject to potential genetic polymorphism. The launch of a new class of antiemetics, the substance P/neurokinin1 receptor antagonists, was attributed to the scientific update on the central generator responsible for emesis and role of substance P. There has been mounting interest in exploring integrative medicine, either acupuncture or acustimulation of P6 (Nei-Kuwan), to complement the western medicine for prevention and management of nausea and vomiting. The potential application of cannabinoids, either alone or in combination with other agents of different mechanism, could contribute further to improve outcome in CINV. Implementation of future treatment guidelines for more effective management of CINV and PONV could certainly improve the efficacy and outcome of cancer and postoperative care.

Stress Symptoms: Effects on Your Body and Behavior

MedlinePlus

... heart disease, obesity and diabetes. Common effects of stress on your body Headache Muscle tension or pain ... drive Stomach upset Sleep problems Common effects of stress on your mood Anxiety Restlessness Lack of motivation ...

How Can I Help a Friend Who Cuts?

MedlinePlus

... friend might injure himself or herself on purpose. Cutting — using a sharp object to cut your own ... upsetting to learn that a friend has been cutting. You might feel confused or scared. You may ...

Balsalazide

MedlinePlus

Side effects from balsalazide can occur. Tell your doctor if any of these symptoms are severe or do not go away: headache abdominal pain upset stomach diarrhea vomiting joint pain difficulty falling or staying asleep tiredness gas runny nose muscle or back ...

Simulator platform for fast reactor operation and safety technology demonstration

DOE Office of Scientific and Technical Information (OSTI.GOV)

Vilim, R. B.; Park, Y. S.; Grandy, C.

2012-07-30

A simulator platform for visualization and demonstration of innovative concepts in fast reactor technology is described. The objective is to make more accessible the workings of fast reactor technology innovations and to do so in a human factors environment that uses state-of-the art visualization technologies. In this work the computer codes in use at Argonne National Laboratory (ANL) for the design of fast reactor systems are being integrated to run on this platform. This includes linking reactor systems codes with mechanical structures codes and using advanced graphics to depict the thermo-hydraulic-structure interactions that give rise to an inherently safe responsemore » to upsets. It also includes visualization of mechanical systems operation including advanced concepts that make use of robotics for operations, in-service inspection, and maintenance.« less

Reduce oil and grease content in wastewater

DOE Office of Scientific and Technical Information (OSTI.GOV)

Capps, R.W.; Matelli, G.N.; Bradford, M.L.

Poor water quality is often blamed on biological oxidation unit malfunction. However, poorly treated water entering the bio-unit is more often the problem. At the microscopic level, oil/water-separation dynamics are influenced by pH, fluid velocity, temperature, and unit volumes. Oily water's physical and chemical properties affect pretreatment systems such as API separators, corrugated plate interception (CPI) separators, air flotation and equalization systems. A better understanding of pretreatment systems' limits and efficiencies can improve wastewater quality before it upsets the biological oxidation (BIOX). Oil contamination in refinery wastewater originates from desalting, steam stripping, product treating, tank drains, sample drains and equipmentmore » washdown. The largest volumetric contributors are cooling tower blowdowns and contaminated stormwater. The paper describes the BIOX process; oil/water separation; oil/water emulsions and colloidal solutions; air flotation; surfactants; DAF (dissolved air flotation) process; IAF (induced air flotation) process; equalization; load factors; salts; and system design.« less

Automatic Fastening Large Structures: a New Approach

NASA Technical Reports Server (NTRS)

Lumley, D. F.

1985-01-01

The external tank (ET) intertank structure for the space shuttle, a 27.5 ft diameter 22.5 ft long externally stiffened mechanically fastened skin-stringer-frame structure, was a labor intensitive manual structure built on a modified Saturn tooling position. A new approach was developed based on half-section subassemblies. The heart of this manufacturing approach will be 33 ft high vertical automatic riveting system with a 28 ft rotary positioner coming on-line in mid 1985. The Automatic Riveting System incorporates many of the latest automatic riveting technologies. Key features include: vertical columns with two sets of independently operating CNC drill-riveting heads; capability of drill, insert and upset any one piece fastener up to 3/8 inch diameter including slugs without displacing the workpiece offset bucking ram with programmable rotation and deep retraction; vision system for automatic parts program re-synchronization and part edge margin control; and an automatic rivet selection/handling system.

Development and Flight Evaluation of an Emergency Digital Flight Control System Using Only Engine Thrust on an F-15 Airplane

NASA Technical Reports Server (NTRS)

Burcham, Frank W., Jr.; Maine, Trindel A.; Fullerton, C. Gordon; Webb, Lannie Dean

1996-01-01

A propulsion-controlled aircraft (PCA) system for emergency flight control of aircraft with no flight controls was developed and flight tested on an F-15 aircraft at the NASA Dryden Flight Research Center. The airplane has been flown in a throttles-only manual mode and with an augmented system called PCA in which pilot thumbwheel commands and aircraft feedback parameters were used to drive the throttles. Results from a 36-flight evaluation showed that the PCA system can be used to safety land an airplane that has suffered a major flight control system failure. The PCA system was used to recover from a severe upset condition, descend, and land. Guest pilots have also evaluated the PCA system. This paper describes the principles of throttles-only flight control; a history of loss-of-control accidents; a description of the F-15 aircraft; the PCA system operation, simulation, and flight testing; and the pilot comments.

Stochastic Stability of Nonlinear Sampled Data Systems with a Jump Linear Controller

NASA Technical Reports Server (NTRS)

Gonzalez, Oscar R.; Herencia-Zapana, Heber; Gray, W. Steven

2004-01-01

This paper analyzes the stability of a sampled- data system consisting of a deterministic, nonlinear, time- invariant, continuous-time plant and a stochastic, discrete- time, jump linear controller. The jump linear controller mod- els, for example, computer systems and communication net- works that are subject to stochastic upsets or disruptions. This sampled-data model has been used in the analysis and design of fault-tolerant systems and computer-control systems with random communication delays without taking into account the inter-sample response. To analyze stability, appropriate topologies are introduced for the signal spaces of the sampled- data system. With these topologies, the ideal sampling and zero-order-hold operators are shown to be measurable maps. This paper shows that the known equivalence between the stability of a deterministic, linear sampled-data system and its associated discrete-time representation as well as between a nonlinear sampled-data system and a linearized representation holds even in a stochastic framework.

Flight testing a propulsion-controlled aircraft emergency flight control system on an F-15 airplane

NASA Technical Reports Server (NTRS)

Burcham, F. W., Jr.; Burken, John; Maine, Trindel A.

1994-01-01

Flight tests of a propulsion-controlled aircraft (PCA) system on an F-15 airplane have been conducted at the NASA Dryden Flight Research Center. The airplane was flown with all flight control surfaces locked both in the manual throttles-only mode and in an augmented system mode. In the latter mode, pilot thumbwheel commands and aircraft feedback parameters were used to position the throttles. Flight evaluation results showed that the PCA system can be used to land an airplane that has suffered a major flight control system failure safely. The PCA system was used to recover the F-15 airplane from a severe upset condition, descend, and land. Pilots from NASA, U.S. Air Force, U.S. Navy, and McDonnell Douglas Aerospace evaluated the PCA system and were favorably impressed with its capability. Manual throttles-only approaches were unsuccessful. This paper describes the PCA system operation and testing. It also presents flight test results and pilot comments.

Measuring the upset of CMOS and TTL due to HPM-signals

NASA Astrophysics Data System (ADS)

Esser, N.; Smailus, B.

2004-05-01

To measure the performance of electronic components when stressed by High Power Microwave signals a setup was designed and tested which allows a well-defined voltage signal to enter the component during normal operation, and to discriminate its effect on the component. The microwave signal is fed to the outside conductor of a coaxial cable and couples into the inner signal line connected to the device under test (DUT). The disturbing HF-signal is transferred almost independent from frequency to maintain the pulse shape in the time domain. The configuration designed to perform a TEM-coupling within a 50 Ohm system prevents the secondary system from feeding back to the primary system and, due to the geometrical parameters chosen, the coupling efficiency is as high as 50-90%. Linear dimensions and terminations applied allow for pulses up to a width of 12ns and up to a voltage level of 4-5 kV on the outside conductor. These pulse parameters proved to be sufficient to upset the DUTs tested so far. In more than 400 measurements a rectangular pulse of increasing voltage level was applied to different types of CMOS and TTL until the individual DUT was damaged. As well the pulse width (3, 6 or 12 ns) and its polarity were varied in single-shot or repetitive-shot experiments (500 shots per voltage at a repetition rate of 3 Hz). The state of the DUT was continuously monitored by measuring both the current of the DUT circuit and that of the oscillator providing the operating signal for the DUT. The results show a very good reproducibility within a set of identical samples, remarkable differences between manufacturers and lower thresholds for repetitive testing, which indicates a memory effect of the DUT to exist for voltage levels significantly below the single-shot threshold.

Simulation of forming a flat forging

NASA Astrophysics Data System (ADS)

Solomonov, K.; Tishchuk, L.; Fedorinin, N.

2017-11-01

The metal flow in some of the metal shaping processes (rolling, pressing, die forging) is subjected to the regularities which determine the scheme of deformation in the metal samples upsetting. The object of the study was the research of the metal flow picture including the contour of the part, the demarcation lines of the metal flow and the flow lines. We have created an algorithm for constructing the metal flow picture, which is based on the representation of the metal flow demarcation line as an equidistant. Computer and physical simulation of the metal flow picture with the help of various software systems confirms the suggested hypothesis.

Redundant single event upset supression system

DOEpatents

Hoff, James R.

2006-04-04

CMOS transistors are configured to operate as either a redundant, SEU-tolerant, positive-logic, cross-coupled Nor Gate SR-flip flop or a redundant, SEU-tolerant, negative-logic, cross-coupled Nand Gate SR-flip flop. The register can operate as a memory, and further as a memory that can overcome the effects of radiation. As an SR-flip flop, the invention can be altered into any known type of latch or flip-flop by the application of external logic, thereby extending radiation tolerance to devices previously incapable of radiation tolerance. Numerous registers can be logically connected and replicated thereby being electronically configured to operate as a redundant circuit.

Characterization of HIRF Susceptibility Threshold for a Prototype Implementation of an Onboard Data Network

NASA Technical Reports Server (NTRS)

Torres-Pomales, Wilfredo

2012-01-01

An experiment was conducted to characterize the effects of HIRF-induced upsets on a prototype onboard data network. The experiment was conducted at the NASA Langley Research Center s High Intensity Radiation Field Laboratory and used a generic distributed system prototyping platform to realize the data network. This report presents the results of the hardware susceptibility threshold characterization which examined the dependence of measured susceptibility on factors like the frequency and modulation of the radiation, layout of the physical nodes and position of the nodes in the test chamber. The report also includes lessons learned during the development and execution of the experiment.

Welding blades to rotors

NASA Technical Reports Server (NTRS)

Hoklo, K. H.; Moore, T. J. (Inventor)

1973-01-01

A process is described to form T-joints between dissimilar thickness parts by magnetic force upset welding. This type of resistance welding is used to join compressor and turbine parts which thereby reduces the weight and cost of jet engines.

TRANSIENT PCDD AND PCDF CONCENTRATIONS IN A MWC

EPA Science Inventory

Time-resolved evaluations of combustor performance have shown that concentrations of polychlorinated dibenzo-p-dioxins and polychlorinated dibenzofurans (PCDDs/Fs) and related pollutants undergo significant changes as a response to upset combustion conditions. During and after tr...

Advanced Hybrid On-Board Science Data Processor - SpaceCube 2.0

NASA Technical Reports Server (NTRS)

Flatley, Tom

2010-01-01

Topics include an overview of On-board science data processing, software upset mitigation, on-board data reduction, on-board products, HyspIRI demonstration testbed, SpaceCube 2.0 block diagram, and processor comparison.

46 CFR 56.70-10 - Preparation (modifies 127.3).

Code of Federal Regulations, 2010 CFR

2010-10-01

... are bored, such boring shall not result in the finished wall thickness after welding being less than... insure satisfactory fitting of rings. (iv) If the piping component ends are upset they may be bored to...

46 CFR 56.70-10 - Preparation (modifies 127.3).

Code of Federal Regulations, 2014 CFR

2014-10-01

... are bored, such boring shall not result in the finished wall thickness after welding being less than... insure satisfactory fitting of rings. (iv) If the piping component ends are upset they may be bored to...

46 CFR 56.70-10 - Preparation (modifies 127.3).

Code of Federal Regulations, 2013 CFR

2013-10-01

... are bored, such boring shall not result in the finished wall thickness after welding being less than... insure satisfactory fitting of rings. (iv) If the piping component ends are upset they may be bored to...

46 CFR 56.70-10 - Preparation (modifies 127.3).

Code of Federal Regulations, 2011 CFR

2011-10-01

... are bored, such boring shall not result in the finished wall thickness after welding being less than... insure satisfactory fitting of rings. (iv) If the piping component ends are upset they may be bored to...

46 CFR 56.70-10 - Preparation (modifies 127.3).

Code of Federal Regulations, 2012 CFR

2012-10-01

... are bored, such boring shall not result in the finished wall thickness after welding being less than... insure satisfactory fitting of rings. (iv) If the piping component ends are upset they may be bored to...

Balancing Act

Cancer.gov

Part of being an Active, More Powerful You means finding balance in your daily life: taking on the Must-dos and finding time for some Should Dos and Want-to-Dos. Sometimes, emotions and commitments can come into play and upset the balance.

Single-event and total-dose effects in geo-stationary transfer orbit during solar-activity maximum period measured by the Tsubasa satellite

NASA Astrophysics Data System (ADS)

Koshiishi, H.; Kimoto, Y.; Matsumoto, H.; Goka, T.

The Tsubasa satellite developed by the Japan Aerospace Exploration Agency was launched in Feb 2002 into Geo-stationary Transfer Orbit GTO Perigee 500km Apogee 36000km and had been operated well until Sep 2003 The objective of this satellite was to verify the function of commercial parts and new technologies of bus-system components in space Thus the on-board experiments were conducted in the more severe radiation environment of GTO rather than in Geo-stationary Earth Orbit GEO or Low Earth Orbit LEO The Space Environment Data Acquisition equipment SEDA on board the Tsubasa satellite had the Single-event Upset Monitor SUM and the DOSimeter DOS to evaluate influences on electronic devices caused by radiation environment that was also measured by the particle detectors of the SEDA the Standard DOse Monitor SDOM for measurements of light particles and the Heavy Ion Telescope HIT for measurements of heavy ions The SUM monitored single-event upsets and single-event latch-ups occurred in the test sample of two 64-Mbit DRAMs The DOS measured accumulated radiation dose at fifty-six locations in the body of the Tsubasa satellite Using the data obtained by these instruments single-event and total-dose effects in GTO during solar-activity maximum period especially their rapid changes due to solar flares and CMEs in the region from L 1 1 through L 11 is discussed in this paper

Radiation tolerance of readout electronics for Belle II

NASA Astrophysics Data System (ADS)

Higuchi, T.; Nakao, M.; Nakano, E.

2012-02-01

We plan to start the Belle II experiment in 2015 and to continue data taking for more than ten years. Because some of the front-end electronics cards of Belle II are located inside the detector, radiation effects onto their components will be a severe problem. Using experimental exposure facilities of neutrons and γ rays, we study the radiation effects from these particles to the Virtex-5 FPGA, optical transceivers, and voltage regulators. The Virtex-5 FPGA is found to keep its operation after irradiation of more than 20-year-equivalent neutron flux of Belle II and 88-year-equivalent γ-ray dose. We observe single event upsets (SEUs) and multiple bit upsets (MBUs) in the Virtex-5 FPGA in the neutron irradiation. We also find almost doubled SEU counts in the Virtex-5 FPGA bombarded from its tail side than its head side. We extrapolate the observed SEU and MBU counts in the Virtex-5 FPGA to the entire readout system of the Belle II central drift chamber, and expect the SEU and MBU rates as one SEU per four minutes and one MBU per 11.5 hours, respectively. The optical transceivers are found to keep its operation after integration of 12-year-equivalent neutron flux, while they are killed by about 3-year-equivalent γ-ray dose, which should be solved in the future research. The voltage regulators are found to keep its operation for more than 10-year-equivalent γ-ray dose.

Reliability of Memories Protected by Multibit Error Correction Codes Against MBUs

NASA Astrophysics Data System (ADS)

Ming, Zhu; Yi, Xiao Li; Chang, Liu; Wei, Zhang Jian

2011-02-01

As technology scales, more and more memory cells can be placed in a die. Therefore, the probability that a single event induces multiple bit upsets (MBUs) in adjacent memory cells gets greater. Generally, multibit error correction codes (MECCs) are effective approaches to mitigate MBUs in memories. In order to evaluate the robustness of protected memories, reliability models have been widely studied nowadays. Instead of irradiation experiments, the models can be used to quickly evaluate the reliability of memories in the early design. To build an accurate model, some situations should be considered. Firstly, when MBUs are presented in memories, the errors induced by several events may overlap each other, which is more frequent than single event upset (SEU) case. Furthermore, radiation experiments show that the probability of MBUs strongly depends on angles of the radiation event. However, reliability models which consider the overlap of multiple bit errors and angles of radiation event have not been proposed in the present literature. In this paper, a more accurate model of memories with MECCs is presented. Both the overlap of multiple bit errors and angles of event are considered in the model, which produces a more precise analysis in the calculation of mean time to failure (MTTF) for memory systems under MBUs. In addition, memories with scrubbing and nonscrubbing are analyzed in the proposed model. Finally, we evaluate the reliability of memories under MBUs in Matlab. The simulation results verify the validity of the proposed model.

Survey of Quantitative Research Metrics to Assess Pilot Performance in Upset Recovery

NASA Technical Reports Server (NTRS)

Le Vie, Lisa R.

2016-01-01

Accidents attributable to in-flight loss of control are the primary cause for fatal commercial jet accidents worldwide. The National Aeronautics and Space Administration (NASA) conducted a literature review to determine and identify the quantitative standards for assessing upset recovery performance. This review contains current recovery procedures for both military and commercial aviation and includes the metrics researchers use to assess aircraft recovery performance. Metrics include time to first input, recognition time and recovery time and whether that input was correct or incorrect. Other metrics included are: the state of the autopilot and autothrottle, control wheel/sidestick movement resulting in pitch and roll, and inputs to the throttle and rudder. In addition, airplane state measures, such as roll reversals, altitude loss/gain, maximum vertical speed, maximum/minimum air speed, maximum bank angle and maximum g loading are reviewed as well.

Sexual and romantic jealousy in heterosexual and homosexual adults.

PubMed

Harris, Christine R

2002-01-01

Several theorists have claimed that men are innately more upset by a mate's sexual infidelity and women are more upset by a mate's emotional infidelity because the sexes faced different adaptive problems (for men, cuckoldry; for women, losing a mate's resources). The present work examined this theory of jealousy as a specific innate module in 196 adult men and women of homosexual and heterosexual orientations. As in previous work, heterosexuals' responses to a forced-choice question about hypothetical infidelity yielded a gender difference. However no gender differences were found when participants recalled personal experiences with a mate's actual infidelity. Men and women, regardless of sexual orientation, on average focused more on a mate's emotional infidelity than on a mate's sexual infidelity. Responses to hypothetical infidelity were uncorrelated with reactions to actual infidelity. This finding casts doubt on the validity of the hypothetical measures used in previous research.

Large forging manufacturing process

DOEpatents

Thamboo, Samuel V.; Yang, Ling

2002-01-01

A process for forging large components of Alloy 718 material so that the components do not exhibit abnormal grain growth includes the steps of: a) providing a billet with an average grain size between ASTM 0 and ASTM 3; b) heating the billet to a temperature of between 1750.degree. F. and 1800.degree. F.; c) upsetting the billet to obtain a component part with a minimum strain of 0.125 in at least selected areas of the part; d) reheating the component part to a temperature between 1750.degree. F. and 1800.degree. F.; e) upsetting the component part to a final configuration such that said selected areas receive no strains between 0.01 and 0.125; f) solution treating the component part at a temperature of between 1725.degree. F. and 1750.degree. F.; and g) aging the component part over predetermined times at different temperatures. A modified process achieves abnormal grain growth in selected areas of a component where desirable.

Telephone survey respondents' reactions to questions regarding interpersonal violence.

PubMed

Black, Michele C; Kresnow, Marcie-jo; Simon, Thomas R; Arias, Ileana; Shelley, Gene

2006-08-01

Concerns have been raised regarding the appropriateness of asking about violence victimization in telephone interviews and whether asking such questions increases respondents' distress or risk for harm. However, no large-scale studies have evaluated the impact of asking such questions during a telephone interview. This study explored respondents' reactions to questions regarding violence in two large recently completed telephone surveys. After respondents were asked about violence, they were asked if they thought surveys should ask such questions and whether they felt upset or afraid because of the questions. In both surveys, the majority of respondents (regardless of their victimization history) were willing to answer questions about violence and were not upset or afraid because of the questions. More than 92% of respondents thought such questions should be asked. These results challenge commonly held beliefs and assumptions and provide some assurance to those concerned with the ethical collection of data on violent victimization.

Application of SEU imaging for analysis of device architecture using a 25 MeV/u 86Kr ion microbeam at HIRFL

NASA Astrophysics Data System (ADS)

Liu, Tianqi; Yang, Zhenlei; Guo, Jinlong; Du, Guanghua; Tong, Teng; Wang, Xiaohui; Su, Hong; Liu, Wenjing; Liu, Jiande; Wang, Bin; Ye, Bing; Liu, Jie

2017-08-01

The heavy-ion imaging of single event upset (SEU) in a flash-based field programmable gate array (FPGA) device was carried out for the first time at Heavy Ion Research Facility in Lanzhou (HIRFL). The three shift register chains with separated input and output configurations in device under test (DUT) were used to identify the corresponding logical area rapidly once an upset occurred. The logic units in DUT were partly configured in order to distinguish the registers in SEU images. Based on the above settings, the partial architecture of shift register chains in DUT was imaged by employing the microbeam of 86Kr ion with energy of 25 MeV/u in air. The results showed that the physical distribution of registers in DUT had a high consistency with its logical arrangement by comparing SEU image with logic configuration in scanned area.

Mothers' physical interventions in toddler play in a low-income, African American sample.

PubMed

Ispa, Jean M; Claire Cook, J; Harmeyer, Erin; Rudy, Duane

2015-11-01

This mixed method study examined 28 low-income African American mothers' physical interventions in their 14-month-old toddlers' play. Inductive methods were used to identify six physical intervention behaviors, the affect accompanying physical interventions, and apparent reasons for intervening. Nonparametric statistical analyses determined that toddlers experienced physical intervention largely in the context of positive maternal affect. Mothers of boys expressed highly positive affect while physically intervening more than mothers of girls. Most physically intervening acts seemed to be motivated by maternal intent to show or tell children how to play or to correct play deemed incorrect. Neutral affect was the most common toddler affect type following physical intervention, but boys were more likely than girls to be upset immediately after physical interventions. Physical interventions intended to protect health and safety seemed the least likely to elicit toddler upset. Copyright © 2015 Elsevier Inc. All rights reserved.

Single Event Upset in Static Random Access Memories in Atmospheric Neutron Environments

NASA Astrophysics Data System (ADS)

Arita, Yutaka; Takai, Mikio; Ogawa, Izumi; Kishimoto, Tadafumi

2003-07-01

Single-event upsets (SEUs) in a 0.4 μm 4 Mbit complementary metal oxide semiconductor (CMOS) static random access memory (SRAM) were investigated in various atmospheric neutron environments at sea level, at an altitude of 2612 m mountain, at an altitude of commercial airplane, and at an underground depth of 476 m. Neutron-induced SEUs increase with the increase in altitude. For a device with a borophosphosilicate glass (BPSG) film, SEU rates induced by thermal neutrons increase with the decrease in the cell charge of a memory cell. A thermal neutron-induced SEU is significant in SRAMs with a small cell charge. With the conditions of small cell charge, thermal neutron-induced SEUs account for 60% or more of the total neutron-induced SEUs. The SEU rate induced by atmospheric thermal neutrons can be estimated by an acceleration test using 252Cf.

A NEW ANTIHYPERTENSIVE AGENT—Clinical Evaluation of a Rauwolfia-Flumethiazide Combination (Rautrax®)

PubMed Central

Nesche, George E.

1960-01-01

Twenty-eight patients were treated with Rautrax,® a combination of flumethiazide, rauwolfia and potassium chloride for from one to seven months. The average mean blood pressure for the group declined from 135 mm. of mercury to 107 mm. All but two of the patients had a decrease in blood pressure and 19 became normotensive. Associated symptoms of headache, dyspnea, edema and angina were completely relieved or improved in the majority of patients with these complaints. On the basis of the blood pressure response and the clinical effects seen in the patient, therapeutic results were classified as good to excellent in 22 of the 28 patients, fair in two, and poor in three. No evaluation was made in the remaining patient in the series because further adjustment in dosage was required. Three patients had side effects—moderate gastrointestinal upset in one case, headache and a sensation of the bladder's having been “wrung out” in another, and headache and paresthesia of the legs in the third. Only the third patient had persisting symptoms after the drug was discontinued. In the other two reduction of dosage sufficed. PMID:14426568

Who Is Most Vulnerable to Social Rejection? The Toxic Combination of Low Self-Esteem and Lack of Negative Emotion Differentiation on Neural Responses to Rejection

PubMed Central

Masten, Carrie L.; Pond, Richard S.; Powell, Caitlin; Combs, David; Schurtz, David R.; Farmer, Antonina S.

2014-01-01

People have a fundamental need to belong that, when satisfied, is associated with mental and physical well-being. The current investigation examined what happens when the need to belong is thwarted—and how individual differences in self-esteem and emotion differentiation modulate neural responses to social rejection. We hypothesized that low self-esteem would predict heightened activation in distress-related neural responses during a social rejection manipulation, but that this relationship would be moderated by negative emotion differentiation—defined as adeptness at using discrete negative emotion categories to capture one's felt experience. Combining daily diary and neuroimaging methodologies, the current study showed that low self-esteem and low negative emotion differentiation represented a toxic combination that was associated with stronger activation during social rejection (versus social inclusion) in the dorsal anterior cingulate cortex and anterior insula—two regions previously shown to index social distress. In contrast, individuals with greater negative emotion differentiation did not show stronger activation in these regions, regardless of their level of self-esteem; fitting with prior evidence that negative emotion differentiation confers equanimity in emotionally upsetting situations. PMID:24594689

Analysis of Control Strategies for Aircraft Flight Upset Recovery

NASA Technical Reports Server (NTRS)

Crespo, Luis G.; Kenny, Sean P.; Cox, David E.; Muri, Daniel G.

2012-01-01

This paper proposes a framework for studying the ability of a control strategy, consisting of a control law and a command law, to recover an aircraft from ight conditions that may extend beyond the normal ight envelope. This study was carried out (i) by evaluating time responses of particular ight upsets, (ii) by evaluating local stability over an equilibrium manifold that included stall, and (iii) by bounding the set in the state space from where the vehicle can be safely own to wings-level ight. These states comprise what will be called the safely recoverable ight envelope (SRFE), which is a set containing the aircraft states from where a control strategy can safely stabilize the aircraft. By safe recovery it is implied that the tran- sient response stays between prescribed limits before converging to a steady horizontal ight. The calculation of the SRFE bounds yields the worst-case initial state corresponding to each control strategy. This information is used to compare alternative recovery strategies, determine their strengths and limitations, and identify the most e ective strategy. In regard to the control law, the authors developed feedback feedforward laws based on the gain scheduling of multivariable controllers. In regard to the command law, which is the mechanism governing the exogenous signals driving the feed- forward component of the controller, we developed laws with a feedback structure that combines local stability and transient response considera- tions. The upset recovery of the Generic Transport Model, a sub-scale twin-engine jet vehicle developed by NASA Langley Research Center, is used as a case study.

Abuse Characteristics and Individual Differences Related to Disclosing Childhood Sexual, Physical, and Emotional Abuse and Witnessed Domestic Violence.

PubMed

Bottoms, Bette L; Peter-Hagene, Liana C; Epstein, Michelle A; Wiley, Tisha R A; Reynolds, Carrie E; Rudnicki, Aaron G

2016-04-01

Many adult survivors of childhood abuse hide their victimization, avoiding disclosure that could identify perpetrators, end the abuse, and bring help to the victim. We surveyed 1,679 women undergraduates to understand disclosure of childhood sexual, physical, and emotional abuse, and, for the first time, witnessed domestic violence, which many consider to be emotionally abusive. A substantial minority of victims failed to ever disclose their sexual abuse (23%), physical abuse (34%), emotional abuse (20%), and witnessed domestic violence (29%). Overall, abuse-specific factors were better predictors of disclosure than individual-level characteristics. Disclosure of sexual abuse was related to experiencing more frequent abuse (by the same and by multiple perpetrators), being more worried about injury and more upset at the time of the abuse, and self-labeling as a victim of abuse. Disclosure of physical abuse was related to experiencing more frequent abuse (by the same and multiple perpetrators), being less emotionally close to the perpetrator, being older when the abuse ended, being more worried and upset, and self-labeling as a victim. Disclosure of emotional abuse was associated with being older when the abuse ended, and being more worried and upset. Disclosure was unrelated to victim demographic characteristics or defensive reactions (dissociative proneness, fantasy proneness, repressive coping style, and temporary forgetting), except that among physical and emotional abuse victims, repressors were less likely to disclose than non-repressors. Disclosure of witnessing domestic violence was not significantly related to any factors measured. © The Author(s) 2014.

Radiation characterization report for the GPS Receiver microcontroller chip. Final report

DOE Office of Scientific and Technical Information (OSTI.GOV)

Not Available

1994-06-20

The overall objective of this characterization test was to determine the sensitivity of the Motorola 68332 32-bit microcontroller to radiation induced single event upset and latch-up (SEU/SEL). The microcontroller is a key component of the GPS Receiver which will be a subsystem of the satellite required for the {open_quotes}FORTE{close_quotes} experiment. Testing was conducted at the Single Event Effects Laboratory at Brookhaven National Laboratory. The results obtained included a latch-up (SEL) threshold LET (Linear Energy Transfer) of 20 MeV-CM{sub 2}/mg and an upset (SEU) threshold LET of 5 MeV-CM{sup 2}/mg. The SEU threshold is typical of this technology, commercial 0.8{mu}m HCMOS.more » Some flow errors were observed that were not reset by the internal watchdog timer of the 68332. It is important that the Receiver design include a monitor of the device, such as an external watch-dog timer, that would initiate a reset of the program when this type of upset occurs. The SEL threshold is lower than would be expected for this 12{mu}m epi layer process and suggests the need for a strategy that would allow for a hard reset of the controller when a latch-up event occurs. Analysis of the galactic cosmic ray spectrum for the FORTE orbit was done and the results indicate a worst case latch-up rate for this device of 6.3 {times} 10{sup {minus}5} latch-ups per device day or roughly one latch-up per 43.5 device years.« less

Modeling of environmentally induced transients within satellites

NASA Technical Reports Server (NTRS)

Stevens, N. John; Barbay, Gordon J.; Jones, Michael R.; Viswanathan, R.

1987-01-01

A technique is described that allows an estimation of possible spacecraft charging hazards. This technique, called SCREENS (spacecraft response to environments of space), utilizes the NASA charging analyzer program (NASCAP) to estimate the electrical stress locations and the charge stored in the dielectric coatings due to spacecraft encounter with a geomagnetic substorm environment. This information can then be used to determine the response of the spacecraft electrical system to a surface discharge by means of lumped element models. The coupling into the electronics is assumed to be due to magnetic linkage from the transient currents flowing as a result of the discharge transient. The behavior of a spinning spacecraft encountering a severe substorm is predicted using this technique. It is found that systems are potentially vulnerable to upset if transient signals enter through the ground lines.

A Numerical Simulation and Statistical Modeling of High Intensity Radiated Fields Experiment Data

NASA Technical Reports Server (NTRS)

Smith, Laura J.

2004-01-01

Tests are conducted on a quad-redundant fault tolerant flight control computer to establish upset characteristics of an avionics system in an electromagnetic field. A numerical simulation and statistical model are described in this work to analyze the open loop experiment data collected in the reverberation chamber at NASA LaRC as a part of an effort to examine the effects of electromagnetic interference on fly-by-wire aircraft control systems. By comparing thousands of simulation and model outputs, the models that best describe the data are first identified and then a systematic statistical analysis is performed on the data. All of these efforts are combined which culminate in an extrapolation of values that are in turn used to support previous efforts used in evaluating the data.

Disruptive Mood Dysregulation Disorder (DMDD)

MedlinePlus

... in adulthood. They are more likely to develop problems with depression or anxiety. Many children are irritable, upset or ... present in other child psychiatric disorders, such as depression, bipolar ... disorder, such as problems with attention or anxiety. This is why it ...

40 CFR 412.46 - New source performance standards (NSPS).

Code of Federal Regulations, 2011 CFR

2011-07-01

... Plant Air Water (SPAW) Hydrology Tool. The evaluation must include all inputs to SPAW including but not...) Provisions for upset/bypass, as provided in 40 CFR 122.41(m)-(n), apply to a new source subject to this...

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

DOE Office of Scientific and Technical Information (OSTI.GOV)

Moran, A.; LaBel, K.; Gates, M.

The authors present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored.

Space life support engineering program

NASA Technical Reports Server (NTRS)

Seagrave, Richard C.

1991-01-01

This report covers the first six months of work performed under the NASA University Grant awarded to Iowa State University to perform research on two topics relating to the development of closed-loop long-term life support systems. A comprehensive study to develop software to simulate the dynamic operation of water reclamation systems in long-term closed-loop life support systems is being carried out as part of an overall program for the design of systems for a Mars voyage. This project is being done in parallel with a similar effort in the Department of Chemistry to develop durable accurate low-cost sensors for monitoring of trace chemical and biological species in recycled water supplies. Aspen-Plus software is being used on a group of high-performance workstations to develop the steady state descriptions for a number of existing technologies. Following completion, a dynamic simulation package will be developed for determining the response of such systems to changes in the metabolic needs of the crew and to upsets in system hardware performance.

An Intelligent computer-aided tutoring system for diagnosing anomalies of spacecraft in operation

NASA Technical Reports Server (NTRS)

Rolincik, Mark; Lauriente, Michael; Koons, Harry C.; Gorney, David

1993-01-01

A new rule-based, expert system for diagnosing spacecraft anomalies is under development. The knowledge base consists of over two-hundred (200) rules and provides links to historical and environmental databases. Environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose. The system's driver translates forward chaining rules into a backward chaining sequence, prompting the user for information pertinent to the causes considered. When the user selects the novice mode, the system automatically gives detailed explanations and descriptions of terms and reasoning as the session progresses, in a sense teaching the user. As such it is an effective tutoring tool. The use of heuristics frees the user from searching through large amounts of irrelevant information and allows the user to input partial information (varying degrees of confidence in an answer) or 'unknown' to any question. The system is available on-line and uses C Language Integrated Production System (CLIPS), an expert shell developed by the NASA Johnson Space Center AI Laboratory in Houston.

Design of lightning protection for a full-authority digital engine control

NASA Technical Reports Server (NTRS)

Dargi, M.; Rupke, E.; Wiles, K.

1991-01-01

The steps and procedures are described which are necessary to achieve a successful lightning-protection design for a state-of-the-art Full-Authority Digital Engine Control (FADEC) system. The engine and control systems used as examples are fictional, but the design and verification methods are real. Topics discussed include: applicable airworthiness regulation, selection of equipment transient design and control levels for the engine/airframe and intra-engine segments of the system, the use of cable shields, terminal-protection devices and filter circuits in hardware protection design, and software approaches to minimize upset potential. Shield terminations, grounding, and bonding are also discussed, as are the important elements of certification and test plans, and the role of tests and analyses. Also included are examples of multiple-stroke and multiple-burst testing. A review of design pitfalls and challenges, and status of applicable test standards such as RTCA DO-160, Section 22, are presented.

Assessing application vulnerability to radiation-induced SEUs in memory

NASA Technical Reports Server (NTRS)

Springer, P. L.

2001-01-01

One of the goals of the Remote Exploration and Experimentation (REE) project at JPL is to determine how vulnerable applications are to single event upsets (SEUs) when run in low radiation space environments using commercial-off-the-shelf (COTS) components.

Evaluation of Recent Technologies of Nonvolatile RAM

NASA Astrophysics Data System (ADS)

Nuns, Thierry; Duzellier, Sophie; Bertrand, Jean; Hubert, Guillaume; Pouget, Vincent; Darracq, FrÉdÉric; David, Jean-Pierre; Soonckindt, Sabine

2008-08-01

Two types of recent nonvolatile random access memories (NVRAM) were evaluated for radiation effects: total dose and single event upset and latch-up under heavy ions and protons. Complementary irradiation with a laser beam provides information on sensitive areas of the devices.

Heavy Ion Testing at the Galactic Cosmic Ray Energy Peak

NASA Technical Reports Server (NTRS)

Pellish, Jonathan A.; Xapsos, M. A.; LaBel, K. A.; Marshall, P. W.; Heidel, D. F.; Rodbell, K. P.; Hakey, M. C.; Dodd, P. E.; Shaneyfelt, M. R.; Schwank, J. R.;

Avoiding plagiarism in academic writing.

PubMed

Anderson, Irene

Plagiarism means taking the work of another and presenting it as one's own, resulting in potential upset for the original author and disrepute for the professions involved. This article aims to explore the issue of plagiarism and some mechanisms for detection and avoidance.

Importance of ion energy on SEU in CMOS SRAMs

DOE Office of Scientific and Technical Information (OSTI.GOV)

Dodd, P.E.; Shaneyfelt, M.R.; Sexton, F.W.

1998-03-01

The single-event upset (SEU) responses of 16 Kbit to 1 Mbit SRAMs irradiated with low and high-energy heavy ions are reported. Standard low-energy heavy ion tests appear to be sufficiently conservative for technologies down to 0.5 {micro}m.

When a Patient Commits Suicide.

ERIC Educational Resources Information Center

Marshall, Karol A.

1980-01-01

Suicide is a tragic and upsetting event which sometimes occurs when a person is in some form of therapy. This paper advocates a process after a patient commits suicide which allows for a thorough and orderly working through of the event by involved treatment personnel. (Author)

Technical challenges of upset recovery training : simulating the element of surprise

DOT National Transportation Integrated Search

2010-07-30

This invited paper is written in the context of a concerted effort by the aviation industry and regulators to reduce the occurrence of Loss of Control (LOC) accidents. LOC accidents have taken the lead among fatal airplane accidents, recently outpaci...

Flight test investigation of the vortex wake characteristics behind a Boeing 727 during two-segment and normal ILS approaches (A joint NASA/FAA report)

NASA Technical Reports Server (NTRS)

Barber, M. R.; Kurkowski, R. L.; Garodz, L. J.; Robinson, G. H.; Smith, H. J.; Jacobsen, R. A.; Stinnett, G. W., Jr.; Mcmurtry, T. C.; Tymczyszyn, J. J.; Devereaux, R. L.

1975-01-01

Flight tests were performed to evaluate the vortex wake characteristics of a Boeing 727 aircraft during conventional and two-segment instrument landing approaches. Smoke generators were used for vortex marking. The vortex was intentionally intercepted by a Lear Jet and a Piper Comanche aircraft. The vortex location during landing approach was measured using a system of phototheodolites. The tests showed that at a given separation distance there are no readily apparent differences in the upsets resulting from deliberate vortex encounters during the two types of approaches. The effect of the aircraft configuration on the extent and severity of the vortices is discussed.

Inflammation arising from obesity reduces taste bud abundance and inhibits renewal.

PubMed

Kaufman, Andrew; Choo, Ezen; Koh, Anna; Dando, Robin

2018-03-01

Despite evidence that the ability to taste is weakened by obesity and can be rescued with weight loss intervention, few studies have investigated the molecular effects of obesity on the taste system. Taste bud cells undergo continual turnover even in adulthood, exhibiting an average life span of only a few weeks, tightly controlled by a balance of proliferation and cell death. Recent data reveal that an acute inflammation event can alter this balance. We demonstrate that chronic low-grade inflammation brought on by obesity reduces the number of taste buds in gustatory tissues of mice-and is likely the cause of taste dysfunction seen in obese populations-by upsetting this balance of renewal and cell death.

Occupational risk and toxicology evaluations of industrial water conditioning.

PubMed

Broussard, G; Bramanti, O; Marchese, F M

1997-08-01

This study addresses the chemical and toxicological questions due to the wide use of chemical treatment programmes for industrial cooling water. First, natural problems encountered in cooling tower systems were presented and grouped into three categories: (i) scaling; (ii) corrosion and (iii) biofouling. Chemical solutions adopted in industrial plants were outlined for each one in order to minimize damage and categorized as shut-down, production loss, heat transfer reduction, upsets, etc. Above all, the purpose of the work was to identify the most dangerous chemicals normally used, which means sources of chemical risk for safety workers and their environment; thus, symptoms of exposure, prevention measures and protection tools are also described.

Consequences of non-medical switch among patients with type 2 diabetes.

PubMed

Flores, Natalia M; Patel, Charmi A; Bookhart, Brahim K; Bacchus, Shaffeeulah

2018-04-27

This study aimed to describe real-world experiences following a non-medical switch among adults with type 2 diabetes mellitus (T2DM) in the United States. For this cross-sectional study, patients with T2DM (N = 451) provided data on demographics, and how a non-medical switch of their anti-hyperglycemic agent (AHA) affected their general health, HbA1c levels and medication management, via an Internet-based survey. Patients self-reported their level of satisfaction with the original medication and emotional reactions to the non-medical switch. Patients who recently experienced a non-medical switch of their AHA(s) (n = 379) were asked about the consequences of switching and their satisfaction with the switch (vs. the original) medication. Patients most frequently reported feeling very/extremely frustrated, surprised, upset and angry in reaction to a non-medical switch. Patients were somewhat satisfied with their original medication. Between 20% and 30% of patients reported the non-medical switch had a moderate/major effect on their general health, diabetes, mental well-being and control over their health. The blood glucose levels of recent switchers were somewhat/much worse (20.7%) and medication management was somewhat/much worse (12.9%) on the switch (vs. the original) medication. Some recent switchers reported old symptoms returning (7.7%) and experiencing new side-effects (14.2%). Approximately one in five patients reported a moderate/major negative impact on their blood glucose level, diabetes, mental well-being, general health and control over their health following a non-medical switch. Findings suggest that a non-medical switch may have unintended negative health consequences and results in considerable burden across multiple domains for a sizeable minority of patients with T2DM.

[Effectiveness and safety of oxcarbazepine in chronic neuropathic pain: a study of 40 cases].

PubMed

Fenollosa-Vázquez, P; Canós-Verdecho, M A; Núñez-Cornejo, C; Pallarés-Delgado, J

Neuropathic pain (NP) often fails to respond to the commonly established analgesic treatment. This fact, together with the existence of side effects, has led to the need to evaluate the analgesic effectiveness of antiepileptic drugs, which, as in the case of oxcarbazepine (OXC), are a valid alternative. The aim of this study was to evaluate the effectiveness and safety of OXC in patients suffering from chronic NP. We conducted a prospective, open study involving a series of 40 patients diagnosed with a long history of NP, which was previously resistant to different kinds of treatment with anticonvulsants, non-steroidal anti-inflammatory (NSAI) drugs, opiates and adjuncts. Patients were treated with OXC and they were evaluated in both the basal (prior to treatment) and final visits (after treatment) by means of the visual analogue scale (VAS), SF-McGill questionnaire and the Lattinen test. The patient's general impression of the result was also obtained. The statistical analysis was performed by calculating the "effect size", by computing Cohen's d. Treatment with OXC diminishes different symptomatic variations of this pain, but especially so in the case of lancinating discharges (d = 0.87, important effect) and burning pain (d = 0.60, moderate-important effect), although the allodynia (d = 0.48, moderate effect) also improved with treatment. In the opinion of the patients themselves, response to treatment was good or very good in 50% of cases. The chief side effects observed were dizziness, drowsiness and abdominal upsets. OXC can be seen as a therapeutic alternative to be taken very much into account in patients with NP having different aetiologies; it has a good benefit-risk ratio and is a form of treatment that is well accepted by patients.

Process optimization of joining by upset bulging with local heating

NASA Astrophysics Data System (ADS)

Rusch, Michael; Almohallami, Amer; Sviridov, Alexander; Bonk, Christian; Behrens, Bernd-Arno; Bambach, Markus

2017-10-01

Joining by upset bulging is a mechanical joining method where axial load is applied to a tube to form two revolving bulges, which clamp the parts to be joined and create a force and form fit. It can be used to join tubes with other structures such as sheets, plates, tubes or profiles of the same or different materials. Other processes such as welding are often limited in joining multi-material assemblies or high-strength materials. With joining by upset bulging at room temperature, the main drawback is the possible initiation of damage (cracks) in the inner buckling zone because of high local stresses and strains. In this paper, a method to avoid the formation of cracks is introduced. Before forming the bulge the tube is locally heated by an induction coil. For the construction steel (E235+N) a maximum temperature of 700 °C was used to avoid phase transformation. For the numerical study of the process the mechanical properties of the tube material were examined at different temperatures and strain rates to determine its flow curves. A parametrical FE model was developed to simulate the bulging process with local heating. Experiments with local heating were executed and metallographic studies of the bulging area were conducted. While specimens heated to 500 °C showed small cracks left, damage-free flanges could be created at 600 and 700 °C. Static testing of damage-free bulges showed improvements in tensile strength and torsion strength compared to bulges formed at room-temperature, while bending and compression behavior remained nearly unchanged. In cyclic testing the locally heated specimens underwent about 3.7 times as many cycles before failure as the specimens formed at room temperature.

Health status among long-term breast cancer survivors suffering from higher levels of fatigue: a cross-sectional study.

PubMed

Álvarez-Salvago, Francisco; Galiano-Castillo, Noelia; Arroyo-Morales, Manuel; Cruz-Fernández, Mayra; Lozano-Lozano, Mario; Cantarero-Villanueva, Irene

2018-05-05

The aims of this study were to evaluate the health status of long-term breast cancer survivors (LTBCS) suffering from higher levels of fatigue, to highlight their needs, and to establish the key points of intervention support programs. A cross-sectional observational study was conducted at the Sport and Health Joint University Institute (iMUDS) between September 2016 and July 2017 with 80 LTBCS that were classified into non-fatigued (≤ 3.9) or fatigued (≥ 4) according to the Piper Fatigue Scale (PFS) total score. The instruments used were the European Organization for Research and Treatment of Cancer Core 30 and its breast cancer (BC) module, the Visual Analog Scale (VAS), the Brief Pain Inventory (BPI), the Scale for Mood Assessment (EVEA), the International Fitness Scale (IFIS), and the Charlson Comorbidity Index. The analysis revealed that 41.2% of LTBCS were considered moderately fatigued and showed significantly higher levels for the categories of "nausea and vomiting" (P = .005), "pain," "dyspnea" and "insomnia" (P < .001), "appetite loss" (P = .002), "financial difficulties" (P = .010), "systemic therapy side effects" (P < .001), "breast symptoms" and "arm symptoms" (P = .002), and "upset by hair loss" (P = .016). In addition, LTBCS presented significantly higher levels of pain in the affected and non-affected arm, "sadness-depression." "anxiety," "anger/hostility" (All: P < .001), and lower general physical fitness (P < .001). The rest of the variables did not show significant differences. LTBCS suffering from higher levels of fatigue had lower QoL, higher level of pain, worse mood state, and lower physical fitness.

Upset susceptibility study employing circuit analysis and digital simulation. [digital systems and electromagnetic interference

NASA Technical Reports Server (NTRS)

Carreno, V. A.

1984-01-01

An approach to predict the susceptibility of digital systems to signal disturbances is described. Electrical disturbances on a digital system's input and output lines can be induced by activities and conditions including static electricity, lightning discharge, electromagnetic interference (EMI), and electromagnetic pulsation (EMP). The electrical signal disturbances employed for the susceptibility study were limited to nondestructive levels, i.e., the system does not sustain partial or total physical damage and reset and/or reload brings the system to an operational status. The front-end transition from the electrical disturbances to the equivalent digital signals was accomplished by computer-aided circuit analysis. The super-sceptre (system for circuit evaluation of transient radiation effects) programs was used. Gate models were developed according to manufacturers' performance specifications and parameters resulting from construction processes characteristic of the technology. Digital simulation at the gate and functional level was employed to determine the impact of the abnormal signals on system performance and to study the propagation characteristics of these signals through the system architecture. Example results are included for an Intel 8080 processor configuration.

14 CFR 23.253 - High speed characteristics.

Code of Federal Regulations, 2013 CFR

2013-01-01

... and characteristics include gust upsets, inadvertent control movements, low stick force gradients in relation to control friction, passenger movement, leveling off from climb, and descent from Mach to... normal attitude and its speed reduced to VMO/MMO, without— (1) Exceptional piloting strength or skill; (2...

14 CFR 23.253 - High speed characteristics.

Code of Federal Regulations, 2014 CFR

2014-01-01

... and characteristics include gust upsets, inadvertent control movements, low stick force gradients in relation to control friction, passenger movement, leveling off from climb, and descent from Mach to... normal attitude and its speed reduced to VMO/MMO, without— (1) Exceptional piloting strength or skill; (2...

Iraq: Regional Perspectives and U.S. Policy

DTIC Science & Technology

2007-01-12

The Regional Strategic Balance and Political Stability . . . . . . . . . . . . . 2 Sectarian and Ethnic Politics and Violence... Political Stability and Energy Security . . . . . . . . . . . . . . 27 Eliminating Transnational Terrorist Threats...Strategic Balance and Political Stability . The removal of the Saddam Hussein regime upset the tenuous political and economic balance that had existed

Incorporating Probability Models of Complex Test Structures to Perform Technology Independent FPGA Single Event Upset Analysis

NASA Technical Reports Server (NTRS)

Berg, M. D.; Kim, H. S.; Friendlich, M. A.; Perez, C. E.; Seidlick, C. M.; LaBel, K. A.

2011-01-01

We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorporated for device evaluation. Included is a comparison to the RTAXS FPGA illustrating the effectiveness of the overall testing methodology.

Emotional Responses to a Televised Nuclear Holocaust Film.

ERIC Educational Resources Information Center

Cantor, Joanne; And Others

1986-01-01

Confirmed expectations that emotional reactions to the movie, "The Day After," would increase with age. Found also that nonpermissive parents (those who had prevented a child from viewing the movie) were more likely than permissive parents to have been upset by the movie. (PD)

Constructive and Unconstructive Repetitive Thought

ERIC Educational Resources Information Center

Watkins, Edward R.

2008-01-01

The author reviews research showing that repetitive thought (RT) can have constructive or unconstructive consequences. The main unconstructive consequences of RT are (a) depression, (b) anxiety, and (c) difficulties in physical health. The main constructive consequences of RT are (a) recovery from upsetting and traumatic events, (b) adaptive…

Integrated circuit with dissipative layer for photogenerated carriers

DOEpatents

Myers, David R.

1989-01-01

The sensitivity of an integrated circuit to single-event upsets is decreased by providing a dissi The U.S. Government has rights in this invention pursuant to Contract No. DE-ACO4-76DP00789 between the Department of Energy and AT&T Technologies, Inc.

Integrated circuit with dissipative layer for photogenerated carriers

DOEpatents

Myers, D.R.

1989-09-12

The sensitivity of an integrated circuit to single-event upsets is decreased by providing a dissi The U.S. Government has rights in this invention pursuant to Contract No. DE-ACO4-76DP00789 between the Department of Energy and AT&T Technologies, Inc.

Physiological and Psychological Characteristics of Successful Combat Controller Trainees

DTIC Science & Technology

2010-08-01

here. Reaction Time. Eye-hand reaction speeds were measured on the Makoto Sports Arena (Makoto USA, Centennial , CO) in reactive and proactive modes... depression , self- consciousness, immoderation, and vulnerability. Individuals that score low in this area are less easily upset and are less emotionally

Surprise

ERIC Educational Resources Information Center

Adler, Jonathan E.

2008-01-01

Surprise is of great value for learning, especially in cases where deep-seated preconceptions and assumptions are upset by vivid demonstrations. In this essay, Jonathan Adler explores the ways in which surprise positively affects us and serves as a valuable tool for motivating learning. Adler considers how students' attention is aroused and…

Controlling Thermal Gradients During Silicon Web Growth

NASA Technical Reports Server (NTRS)

Duncan, C. S.; Mchugh, J. P.; Skutch, M. E.; Piotrowski, P. A.

1983-01-01

Strategically placed slot helps to control critical thermal gradients in crucible for silicon web growth. Slot thermally isolates feed region of crucible from growth region; region where pellets are added stays hot. Heat absorbed by pellets during melting causes thermal unbalance than upsets growth conditions.

Effects of space radiation on electronic microcircuits

NASA Technical Reports Server (NTRS)

Kolasinski, W. A.

1989-01-01

The single event effects or phenomena (SEP), which so far have been observed as events falling on one or another of the SE classes: Single Event Upset (SEU), Single Event Latchup (SEL) and Single Event Burnout (SEB), are examined. Single event upset is defined as a lasting, reversible change in the state of a multistable (usually bistable) electronic circuit such as a flip-flop or latch. In a computer memory, SEUs manifest themselves as unexplained bit flips. Since latchup is in general caused by a single event of short duration, the single event part of the SEL term is superfluous. Nevertheless, it is used customarily to differentiate latchup due to a single heavy charged particle striking a sensitive cell from more ordinary kinds of latchup. Single event burnout (SEB) refers usually to total instantaneous failure of a power FET when struck by a single particle, with the device shorting out the power supply. An unforeseen failure of these kinds can be catastrophic to a space mission, and the possibilities are discussed.

Using a Non-Fit Message Helps to De-Intensify Negative Reactions to Tough Advice.

PubMed

Fridman, Ilona; Scherr, Karen A; Glare, Paul A; Higgins, E Tory

2016-08-01

Sometimes physicians need to provide patients with potentially upsetting advice. For example, physicians may recommend hospice for a terminally ill patient because it best meets their needs, but the patient and their family dislike this advised option. We explore whether regulatory non-fit could be used to improve these types of situations. Across five studies in which participants imagined receiving upsetting advice from a physician, we demonstrate that regulatory non-fit between the form of the physician's advice (emphasizing gains vs. avoiding losses) and the participants' motivational orientation (promotion vs. prevention) improves participants' evaluation of an initially disliked option. Regulatory non-fit de-intensifies participants' initial attitudes by making them less confident in their initial judgments and motivating them to think more thoroughly about the arguments presented. Furthermore, consistent with previous research on regulatory fit, we showed that the mechanism of regulatory non-fit differs as a function of participants' cognitive involvement in the evaluation of the option. © 2016 by the Society for Personality and Social Psychology, Inc.

Allotropic forms of carbon in the Invar Fe-Ni-C alloy before and after plastic deformation by upsetting

NASA Astrophysics Data System (ADS)

Nadutov, V. M.; Vashchuk, D. L.; Karbivskii, V. L.; Volosevich, P. Yu.; Davydenko, O. A.

2018-04-01

The effect of cold plastic deformation by upsetting (e = 1.13) on structure and hybridised bonds of carbon in the fcc Invar Fe-30.9%Ni-1.23% C alloy was studied by means of X-ray phase analysis and X-ray photoelectron spectroscopy. Carbon precipitates along grain boundaries and inside of grains in the alloy after annealing and plastic deformation were revealed. The presence of mainly sp2- and sp3-hybridised C-C bonds attributing to graphite and amorphous carbon as well as the carbon bonds with impurity atoms and metallic Fe and Ni atoms in austenitic phase were revealed in the annealed and deformed alloy. It was shown for the first time that plastic deformation of the alloy results in partial destruction of the graphite crystal structure, increasing the relative part of amorphous carbon, and redistribution of carbon between structural elements as well as in a solid solution of austenitic phase.

Hydrotreater/Distillation Column Hazard Analysis Report Rev. 2

DOE Office of Scientific and Technical Information (OSTI.GOV)

Lowry, Peter P.; Wagner, Katie A.

This project Hazard and Risk Analysis Report contains the results of several hazard analyses and risk assessments. An initial assessment was conducted in 2012, which included a multi-step approach ranging from design reviews to a formal What-If hazard analysis. A second What-If hazard analysis was completed during February 2013 to evaluate the operation of the hydrotreater/distillation column processes to be installed in a process enclosure within the Process Development Laboratory West (PDL-West) facility located on the PNNL campus. The qualitative analysis included participation of project and operations personnel and applicable subject matter experts. The analysis identified potential hazardous scenarios, eachmore » based on an initiating event coupled with a postulated upset condition. The unmitigated consequences of each hazardous scenario were generally characterized as a process upset; the exposure of personnel to steam, vapors or hazardous material; a spray or spill of hazardous material; the creation of a flammable atmosphere; or an energetic release from a pressure boundary.« less

In temperature forming of friction stir lap welds in aluminium alloys

NASA Astrophysics Data System (ADS)

Bruni, Carlo; Cabibbo, Marcello; Greco, Luciano; Pieralisi, Massimiliano

2018-05-01

The objective of such investigation is the study in depth of the forming phase of welds realized on three sheet metal blanks in aluminium alloys by friction stir lap welding. Such forming phase was performed by upsetting at different constant forming temperatures varying from 200°C to 350°C with constant ram velocities of 0.01 and 0.1 mm/s. The temperature values were obtained by the use of heating strips applied on the upper tool and on the lower tool. It was observed an increase in the friction factor, acting at the upsetting tool-workpiece interface, with increasing temperature that is very useful in producing the required localized deformation with which to improve the weld. It was also confirmed that the forming phase allows to realize a required thickness in the weld area allowing to neglect the surficial perturbation produced by the friction stir welding tool shoulder. The obtained thickness could be subjected to springback when too low temperatures are considered.

Using a Non-Fit Message Helps to De-Intensify Negative Reactions to Tough Advice

PubMed Central

Fridman, Ilona; Scherr, Karen; Glare, Paul; Higgins, E. Tory

2017-01-01

Sometimes physicians need to provide patients with potentially upsetting advice. For example, physicians may recommend hospice for a terminally ill patient because it best meets their needs, but the patient and their family dislike this advised option. We explore whether regulatory non-fit could be used to improve these types of situations. Across five studies in which participants imagined receiving upsetting advice from a physician, we demonstrate that regulatory non-fit between the form of the physician’s advice (emphasizing gains vs. avoiding losses) and the participants’ motivational orientation (promotion vs. prevention) improves participants’ evaluation of an initially disliked option. Regulatory non-fit de-intensifies participants’ initial attitudes by making them less confident in their initial judgments and motivating them to think more thoroughly about the arguments presented. Furthermore, consistent with previous research on regulatory fit, we showed that the mechanism of regulatory non-fit differs as a function of participants’ cognitive involvement in the evaluation of the option. PMID:27341845

Streamlining your demulsification program

DOE Office of Scientific and Technical Information (OSTI.GOV)

Svetgoff, J.

1989-09-01

According to this article, demulsification should be viewed as a wide reaching concept that takes into consideration many factors. These include: oil quality, water quality, effect of solids on the demulsification process, consideration of the completeness of the dehydration process, consideration of the most effective use of surface equipment, the use of heat, and cost of the demulsification program. The author discusses how the best demulsification program results in the synergistic use of heat, demulsifier chemicals, electricity, and retention time to provide clean oil and clean water with minimum treating system problems. In addition, these goals should be accomplished atmore » a reasonable cost. However, the amount of heat, chemicals, electricity, or retention time used in a program should not be reduced to the bare minimum. A slight excess of each is necessary to ensure a trouble-free program in most oil field systems. If a producer tries to operate on the ragged edge as far as system resources are concerned, upsets will occur because of the ever-changing nature of oil field systems.« less

Upset susceptibility study employing circuit analysis and digital simulation

NASA Technical Reports Server (NTRS)

Carreno, V. A.

1984-01-01

This paper describes an approach to predicting the susceptibility of digital systems to signal disturbances. Electrical disturbances on a digital system's input and output lines can be induced by activities and conditions including static electricity, lightning discharge, Electromagnetic Interference (EMI) and Electromagnetic Pulsation (EMP). The electrical signal disturbances employed for the susceptibility study were limited to nondestructive levels, i.e., the system does not sustain partial or total physical damage and reset and/or reload will bring the system to an operational status. The front-end transition from the electrical disturbances to the equivalent digital signals was accomplished by computer-aided circuit analysis. The Super-Sceptre (system for circuit evaluation of transient radiation effects) Program was used. Gate models were developed according to manufacturers' performance specifications and parameters resulting from construction processes characteristic of the technology. Digital simulation at the gate and functional level was employed to determine the impact of the abnormal signals on system performance and to study the propagation characteristics of these signals through the system architecture. Example results are included for an Intel 8080 processor configuration.

An on-line expert system for diagnosing environmentally induced spacecraft anomalies using CLIPS

NASA Technical Reports Server (NTRS)

Lauriente, Michael; Rolincik, Mark; Koons, Harry C; Gorney, David

1993-01-01

A new rule-based, expert system for diagnosing spacecraft anomalies is under development. The knowledge base consists of over two-hundred rules and provide links to historical and environmental databases. Environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose. The system's driver translates forward chaining rules into a backward chaining sequence, prompting the user for information pertinent to the causes considered. The use of heuristics frees the user from searching through large amounts of irrelevant information (varying degrees of confidence in an answer) or 'unknown' to any question. The expert system not only provides scientists with needed risk analysis and confidence estimates not available in standard numerical models or databases, but it is also an effective learning tool. In addition, the architecture of the expert system allows easy additions to the knowledge base and the database. For example, new frames concerning orbital debris and ionospheric scintillation are being considered. The system currently runs on a MicroVAX and uses the C Language Integrated Production System (CLIPS).

Evaluation of an Ultra-Low Power Reed Solomon Encoder for NASA's Space Technology 5 Mission

NASA Technical Reports Server (NTRS)

Li, K. E.; Xapsos, M. A.; Poivey, C.; LaBel, K. A.; Stone, R. F.; Yeh, P-S.; Gambles, J.; Hass, J.; Maki, G.; Marguia, J.

2003-01-01

This viewgraph presentation provides information on radiation tests on encoders intended for a constellation of microsatellites. The encoders use CMOS Ultra-Low Power Radiation Tolerant (CULPRiT) technology. The presentation addresses power consumption, radiation dosage, and Single Event Upset (SEU).

Oikos, The Environment and Education. Fastback 52.

ERIC Educational Resources Information Center

O'Hearn, George T.

Designed for individuals in the educational process, this publication concerns the quality of human life. Major environmental problems are discussed, handling of these issues will determine our future direction. Man's belief that freedom places him separate from the environment causes drastic changes, upsetting the ecosystem balance. Wise…

14 CFR 25.253 - High-speed characteristics.

Code of Federal Regulations, 2010 CFR

2010-01-01

... 14 Aeronautics and Space 1 2010-01-01 2010-01-01 false High-speed characteristics. 25.253 Section...-speed characteristics. (a) Speed increase and recovery characteristics. The following speed increase and... inadvertent speed increases (including upsets in pitch and roll) must be simulated with the airplane trimmed...

14 CFR 25.253 - High-speed characteristics.

Code of Federal Regulations, 2011 CFR

2011-01-01

... 14 Aeronautics and Space 1 2011-01-01 2011-01-01 false High-speed characteristics. 25.253 Section...-speed characteristics. (a) Speed increase and recovery characteristics. The following speed increase and... inadvertent speed increases (including upsets in pitch and roll) must be simulated with the airplane trimmed...

Your Child's Development: 3-5 Days

MedlinePlus

... calms self when upset has periods of alertness Cognitive Skills (Thinking and Learning) looks at and follows faces when quiet and alert stares briefly at bright objects placed in front of the face When to Talk to Your Doctor Every child develops at his or her own pace, but ...

Identity Distress among Youth Exposed to Natural Disasters: Associations with Level of Exposure, Posttraumatic Stress, and Internalizing Problems.

PubMed

Scott, Brandon G; Sanders, Ashley F P; Graham, Rebecca A; Banks, Donice M; Russell, Justin D; Berman, Steven L; Weems, Carl F

2014-10-01

Identity distress involves intense or prolonged upset or worry about personal identity issues including long-term goals, career choice, friendships, sexual orientation and behavior, religion, values and beliefs, and group loyalties. Research suggests that trauma exposure and subsequent PTSD symptoms may negatively impact identity development and psychological adjustment. However, little is known about their specific associations with identity distress and internalizing problems among disaster-exposed adolescents. The purpose of this study was to examine these relationships in a sample of 325 adolescents (60% female; 89% African American) who experienced a major natural disaster and its aftermath. The results indicated that identity distress was positively associated with age, hurricane exposure, PTSD symptoms, and internalizing problems. Linear regression analyses also showed that identity distress was uniquely associated with internalizing symptoms and that there was an indirect effect of hurricane exposure on identity distress via PTSD symptoms. Finally, PTSD symptoms moderated the link between identity distress and internalizing symptoms, with a significant positive slope found for youth with more PTSD symptoms. Findings were generally consistent with previous work and predictions, and add to the extant knowledge about identity distress by providing data on the linkages between disaster exposure, posttraumatic stress and internalizing problems in adolescents.

Cancer-related Traumatic Stress Reactions in Siblings of Children with Cancer

PubMed Central

Kaplan, Lynne M.; Kaal, K. Julia; Bradley, Lauren; Alderfer, Melissa A.

2013-01-01

Objective To explore cancer-related posttraumatic stress (PTS) reactions in siblings of children with cancer including prevalence, common symptoms, comorbidity with anxiety and depression, and gender and age-related patterns. Method A total of 125 children (63 females) between the ages of 8 and 17 (M = 12.4; SD = 2.9 years) with a brother or sister with cancer, diagnosed 4 to 38 months prior to the study (M = 1.3 years; SD = 6.7 months), completed the Child PTSD Symptom Scale (CPSS), Revised Children's Manifest Anxiety Scale, and Child Depression Inventory-Short Form. Results Over half of the sample (60%) scored in the moderate to severe range for PTS and 22% fulfilled full criteria for PTSD based upon CPSS responses. Nearly 75% reported “Feeling upset when you think about or hear about the cancer,” and “Trying not to think about, talk about, or have feelings about the cancer.” Over 60% reported arousal symptoms. PTS symptoms reportedly interfered with functioning for 75% of the sample and co-occurred with anxiety and depressive symptoms. Gender and age-related patterns were not found. Conclusions Siblings of children with cancer experience cancer-related PTS reactions and greater attention should be paid to ameliorating their cancer-related distress with empirically-based treatments. PMID:23795631

Caring for our wounded warriors: A qualitative examination of health-related quality of life in caregivers of individuals with military-related traumatic brain injury

PubMed Central

Carlozzi, Noelle E.; Brickell, Tracey A.; Psych, D.; French, Louis M.; Sander, Angelle; Kratz, Anna L.; Tulsky, David S.; Chiaravalloti, Nancy D.; Hahn, Elizabeth A.; Kallen, Michael; Austin, Amy M.; Miner, Jennifer A.; Lange, Rael T.

2016-01-01

Objective To develop a conceptual framework that captures aspects of health-related quality of life (HRQOL) for caregivers of individuals with military-related traumatic brain injury (TBI). Design Qualitative data from nine focus groups composed of caregivers of wounded warriors with a medically documented TBI were analyzed. Setting Focus group participants were recruited through Walter Reed National Military Medical Center (WRNMMC), community outreach and support groups. Participants 45 caregivers of wounded warriors who had sustained a mild, moderate, severe, or penetrating TBI. Results Qualitative frequency analysis indicated that caregivers most frequently discussed social health (44% of comments), followed by emotional (40%) and physical health (12%). Areas of discussion that were specific to this population included: anger regarding barriers to health services (for caregivers and service members), emotional suppression (putting on a brave face for others, even when things are not going well), and hypervigilance (controlling one’s behavior/environment to prevent upsetting the service member). Conclusion Caring for wounded warriors with TBI is a complex experience that positively and negatively affects HRQOL. While some aspects of HRQOL can be evaluated with existing measures, evaluation of other important components does not exist. The development of military-specific measures would help facilitate better care for these individuals. PMID:27997672

AirSTAR: A UAV Platform for Flight Dynamics and Control System Testing

NASA Technical Reports Server (NTRS)

Jordan, Thomas L.; Foster, John V.; Bailey, Roger M.; Belcastro, Christine M.

2006-01-01

As part of the NASA Aviation Safety Program at Langley Research Center, a dynamically scaled unmanned aerial vehicle (UAV) and associated ground based control system are being developed to investigate dynamics modeling and control of large transport vehicles in upset conditions. The UAV is a 5.5% (seven foot wingspan), twin turbine, generic transport aircraft with a sophisticated instrumentation and telemetry package. A ground based, real-time control system is located inside an operations vehicle for the research pilot and associated support personnel. The telemetry system supports over 70 channels of data plus video for the downlink and 30 channels for the control uplink. Data rates are in excess of 200 Hz. Dynamic scaling of the UAV, which includes dimensional, weight, inertial, actuation, and control system scaling, is required so that the sub-scale vehicle will realistically simulate the flight characteristics of the full-scale aircraft. This testbed will be utilized to validate modeling methods, flight dynamics characteristics, and control system designs for large transport aircraft, with the end goal being the development of technologies to reduce the fatal accident rate due to loss-of-control.

Defamation and Freedom of the Press

ERIC Educational Resources Information Center

Keeton, W. Page

1976-01-01

The English and American defamation principles are compared, including the various privileges to defame and defenses to liability. The author, a professor of law in torts, suggests that the law of defamation can be simplified without upsetting the proper balance between protecting personal reputations and encouraging the free interchange of ideas.…

Teaching Controversial Issues of Bioethics.

ERIC Educational Resources Information Center

Stronck, David R.

Many teachers avoid controversial topics because they do not want to upset students or parents, do not know appropriate instructional strategies, and fail to recognize the importance of motivating students through placing science in its relevant context. An example is provided for use in a methods course for helping future high school teachers to…

Truth exposed in The Hospital documentary.

PubMed

Lodge, Sue Wise

2017-01-25

The Hospital documentary is excellent and upsetting but truthful. Well done to all those involved. I have worked in the NHS for almost 40 years and am exasperated at what's happened to the NHS. I'd like to think Jeremy Hunt is watching the programme, but I am not holding my breath.

The Snowball Blizzard Incident: A Reality Rub Life Space Interview.

ERIC Educational Resources Information Center

Long, Nicholas J.; Pinciotti, Dennis

1992-01-01

Focuses on Reality Rub Interview, one type of Life Space Interview (LSI), effective intervention strategy for use during crisis work with troubled students. Presents actual Reality Rub Interview, used with students who have "social blindness, social myopia, and tunnel vision" and who, when upset, misinterpret words and behaviors of…

Criterion 3: Maintenance of forest ecosystem health and vitality

Treesearch

Stephen R. Shifley; Francisco X. Aguilar; Nianfu Song; Susan I. Stewart; David J. Nowak; Dale D. Gormanson; W. Keith Moser; Sherri Wormstead; Eric J. Greenfield

2012-01-01

Forest ecosystem health depends on stable forest composition and structure and on sustainable ecosystem processes. Forest disturbances that push an ecosystem beyond the range of conditions considered normal can upset the balance among processes, exacerbate forest health problems, and increase mortality beyond historical norms. Sometimes forest ecosystems respond to...

New Zealand Police and Restorative Justice Philosophy

ERIC Educational Resources Information Center

Winfree, L. Thomas, Jr.

2004-01-01

In New Zealand, selected sworn police officers called youth aid officers participate in discussions and deliberations concerning the actions required to restore the sense of community balance upset by the actions of juvenile offenders. The author explores a representative sample of all sworn police officers serving in the New Zealand Police,…

SEU Test Facility

Science.gov Websites

to the effects of ionizing radiation. This is of particular concern for space applications due to the develop a powerful and user-friendly test facility for investigating space-radiation effects on micro -electronic devices[1]. The main type of effects studied are the so called Single Event Upsets (SEUs) where

TVDG Home Page

Science.gov Websites

Download WinZip Radiation Effects Testing and Calibration This facility is available for the study of space radiation effects, in particular, Single Event Upset ( SEU ) Testing and Spacecraft Instrument Calibration information about our facility. Visit our Space and Radiation Effects Links page to find out what is going on

Energy Drinks: A New Health Hazard for Adolescents

ERIC Educational Resources Information Center

Pennington, Nicole; Johnson, Molly; Delaney, Elizabeth; Blankenship, Mary Beth

2010-01-01

A new hazard for adolescents is the negative health effects of energy drink consumption. Adolescents are consuming these types of drinks at an alarming amount and rate. Specific effects that have been reported by adolescents include jitteriness, nervousness, dizziness, the inability to focus, difficulty concentrating, gastrointestinal upset, and…

75 FR 10174 - Source-Specific Federal Implementation Plan for Navajo Generating Station; Navajo Nation

Federal Register 2010, 2011, 2012, 2013, 2014

2010-03-05

... Reclamation, the Los Angeles Department of Water and Power, the Arizona Public Service, the Nevada Power... over any normal 6 minute period, excluding condensed water vapour, and 40% opacity, averaged over 6 minutes, during absorber upset transition periods. The final opacity standard excludes uncombined water...

Forecasting College Costs Through 1988-89.

ERIC Educational Resources Information Center

Henderson, Cathy

1986-01-01

If inflation and unemployment remain low, then average annual increases in total student charges should continue to drop. The key to slower growth in student charges is sustained low inflation rates. The return of high unemployment or dramatic cuts in need-based federal student aid programs could upset the balance. (MLW)

Teaching about the Child and World Environment: Elementary Teacher's Kit.

ERIC Educational Resources Information Center

Morris, Donald M.

Three environmental education units relating environmental concerns to elementary school students' own experiences are described in this materials packet. Emphasis is on helping students become more sensitive to human and personal dimensions of environmental upset. Designed to teach children about themselves and their air, water, and land…

Technological Change, Globalization, and the Community College

ERIC Educational Resources Information Center

Romano, Richard M.; Dellow, Donald A.

2009-01-01

In early nineteenth-century England, workers now known as Luddites roamed the countryside destroying machinery that they saw as creating unemployment and upsetting their traditional way of life. They believed that the growing mechanization of production, what people would now call technological change, and the expanding volume of trade ushered in…

The Perceived Intent of Potentially Offensive Sexual Behaviors among Adolescents

ERIC Educational Resources Information Center

Lacasse, Anne; Mendelson, Morton J.

2006-01-01

Individual differences may partly explain how students react to potentially offensive sexual behaviors from peers. This study focused on situational and personal characteristics that may make such behaviors more or less upsetting. Six hundred and thirty two Quebecois high-school students in Grades 8-11 completed questionnaires regarding their…

40 CFR 60.56a - Standards for municipal waste combustor operating practices.

Code of Federal Regulations, 2012 CFR

2012-07-01

... cause such facility to exceed the carbon monoxide standards shown in table 1. Table 1—MWC Operating..., at a minimum, address the following elements of MWC unit operation: (1) Summary of the applicable... periodic upset or off-specification conditions; (8) Procedures for minimizing particulate matter carryover...

40 CFR 60.56a - Standards for municipal waste combustor operating practices.

Code of Federal Regulations, 2013 CFR

2013-07-01

... cause such facility to exceed the carbon monoxide standards shown in table 1. Table 1—MWC Operating..., at a minimum, address the following elements of MWC unit operation: (1) Summary of the applicable... periodic upset or off-specification conditions; (8) Procedures for minimizing particulate matter carryover...

40 CFR 60.56a - Standards for municipal waste combustor operating practices.

Code of Federal Regulations, 2011 CFR

2011-07-01

... cause such facility to exceed the carbon monoxide standards shown in table 1. Table 1—MWC Operating..., at a minimum, address the following elements of MWC unit operation: (1) Summary of the applicable... periodic upset or off-specification conditions; (8) Procedures for minimizing particulate matter carryover...

40 CFR 60.56a - Standards for municipal waste combustor operating practices.

Code of Federal Regulations, 2014 CFR

2014-07-01

... cause such facility to exceed the carbon monoxide standards shown in table 1. Table 1—MWC Operating..., at a minimum, address the following elements of MWC unit operation: (1) Summary of the applicable... periodic upset or off-specification conditions; (8) Procedures for minimizing particulate matter carryover...

Unearthing a Genre

ERIC Educational Resources Information Center

Fink, Leon

2007-01-01

Much of academic publishing depends on peer review, a literary form that never sees the light of day and only rarely reveals its author's name to the intended reader. While a negative judgment can be upsetting, the serious review, no matter what the ultimate verdict on publication, normally contains probing comments and suggestions that will keep…

"Upsetting the Apple Cart": Issues of Diversity in Preservice Teacher Education

ERIC Educational Resources Information Center

Liggett, Tonda; Finley, Susan

2009-01-01

Over the last decade, teacher preparation programs at colleges and universities across the United States have attempted to respond to the challenges of preparing teachers for the increasing diversity that is represented in public schools today. Teacher programs have responded to these challenges by altering courses, curriculum, fieldwork…

Unbalancing Acts: Plagiarism as Catalyst for Instructor Emotion in the Composition Classroom

ERIC Educational Resources Information Center

Biswas, Ann E.

2016-01-01

In this essay, the author reflects on her experiences while researching composition instructors' emotional responses to plagiarism. The research found that instructors faced a variety of complex and competing feelings when students plagiarized, and those responses threatened to upset relationships, power structures, and professional identities in…

Integrated circuit with dissipative layer for photogenerated carriers

DOEpatents

Myers, D.R.

1988-04-20

The sensitivity of an integrated circuit to single-event upsets is decreased by providing a dissipative layer of silicon nitride between a silicon substrate and the active device. Free carriers generated in the substrate are dissipated by the layer before they can build up charge on the active device. 1 fig.

Tuning maps for setpoint changes and load disturbance upsets in a three capacity process under multivariable control

NASA Technical Reports Server (NTRS)

Litt, Jonathan S.; Smith, Ira C.

1991-01-01

Tuning maps are an aid in the controller tuning process because they provide a convenient way for the plant operator to determine the consequences of adjusting different controller parameters. In this application the maps provide a graphical representation of the effect of varying the gains in the state feedback matrix on startup and load disturbance transients for a three capacity process. Nominally, the three tank system, represented in diagonal form, has a Proportional-Integral control on each loop. Cross coupling is then introduced between the loops by using non-zero off-diagonal proportional parameters. Changes in transient behavior due to setpoint and load changes are examined by varying the gains of the cross coupling terms.

Hair diseases: a big problem on a small surface

PubMed Central

Wcisło-Dziadecka, Dominika

2016-01-01

Civilizational progress initially contributes to the problem of hair loss and then to alopecia as regards both frequency and therapeutic dilemmas. The work presents trichological problems which occur more rarely, i.e. drug-induced, anagen and telogen alopecia, congenital and acquired structural hair disorders, psychic disturbances concerning the hair as well as the hair during menopause. Then, the article briefly describes contagious (infectious) diseases as well as diseases with inflammatory etiology which are accompanied by exfoliation and (frequently) pruritus. Finally, alopecia cicatricans is discussed. Alopecia areata and androgenetic alopecia are omitted herein because they occur more often and will be described in another work. Any disproportions and upset balance concerning correct functioning of mechanisms within the scalp hair system are the evidence of pathologies. PMID:27881935

Hair diseases: a big problem on a small surface.

PubMed

Brzezińska-Wcisło, Ligia A; Wcisło-Dziadecka, Dominika

2016-10-01

Civilizational progress initially contributes to the problem of hair loss and then to alopecia as regards both frequency and therapeutic dilemmas. The work presents trichological problems which occur more rarely, i.e. drug-induced, anagen and telogen alopecia, congenital and acquired structural hair disorders, psychic disturbances concerning the hair as well as the hair during menopause. Then, the article briefly describes contagious (infectious) diseases as well as diseases with inflammatory etiology which are accompanied by exfoliation and (frequently) pruritus. Finally, alopecia cicatricans is discussed. Alopecia areata and androgenetic alopecia are omitted herein because they occur more often and will be described in another work. Any disproportions and upset balance concerning correct functioning of mechanisms within the scalp hair system are the evidence of pathologies.

Inflammation arising from obesity reduces taste bud abundance and inhibits renewal

PubMed Central

Kaufman, Andrew; Choo, Ezen; Koh, Anna

2018-01-01

Despite evidence that the ability to taste is weakened by obesity and can be rescued with weight loss intervention, few studies have investigated the molecular effects of obesity on the taste system. Taste bud cells undergo continual turnover even in adulthood, exhibiting an average life span of only a few weeks, tightly controlled by a balance of proliferation and cell death. Recent data reveal that an acute inflammation event can alter this balance. We demonstrate that chronic low-grade inflammation brought on by obesity reduces the number of taste buds in gustatory tissues of mice—and is likely the cause of taste dysfunction seen in obese populations—by upsetting this balance of renewal and cell death. PMID:29558472

Summary of aluminum nitrate tests at the F/H-ETF

DOE Office of Scientific and Technical Information (OSTI.GOV)

McCabe, D.J.; Wiggins, A.W.

1992-05-01

Biofouling of the Norton ceramic filters in the F/H Effluent Treatment Facility (ETF) has been minimized by bacterial control strategies on the influent streams. However, enough bacteria still exists in the routine influent to impact the filter performance. One method of remediating biofouling in routine influent, initially observed in laboratory tests on simulant solutions, involves addition of aluminum nitrate to the influent wastewater. Tests on actual feed at the ETF using aluminum nitrate showed significantly improved performance, with increases in filter permeability of up to four-fold compared to the baseline case. These improvements were only realized after modifications to themore » pH adjustment system were completed which minimized upsets in the pH of the feed solutions.« less

Environment induced anomalies on the TDRS and the role of spacecraft charging

NASA Technical Reports Server (NTRS)

Garrett, H. B.; Whittlesey, A.; Daughtridge, S.

1990-01-01

The NASA Tracking and Data Relay Satellites (TDRS) have experienced several classes of anomalies that appear to be related to the natural environment. The most serious of these have been anomalies in the Attitude Control System control processor electronics which resulted in check sum errors that were ultimately traced to high-energy, particle-induced single event upsets in the RAM memory. Three other types of anomalies on TDRS have also been correlated with environmental effects. This paper briefly documents the occurrences of these anomalies and describes the nature of each. These events are correlated with various environmental factors. For all cases, there appears to be a causal relationship between spacecraft charging events and the engineering anomalies.

First results of the front-end ASIC for the strip detector of the PANDA MVD

NASA Astrophysics Data System (ADS)

Quagli, T.; Brinkmann, K.-T.; Calvo, D.; Di Pietro, V.; Lai, A.; Riccardi, A.; Ritman, J.; Rivetti, A.; Rolo, M. D.; Stockmanns, T.; Wheadon, R.; Zambanini, A.

2017-03-01

PANDA is a key experiment of the future FAIR facility and the Micro Vertex Detector (MVD) is the innermost part of its tracking system. PASTA (PAnda STrip ASIC) is the readout chip for the strip part of the MVD. The chip is designed to provide high resolution timestamp and charge information with the Time over Threshold (ToT) technique. Its architecture is based on Time to Digital Converters with analog interpolators, with a time bin width of 50 ps. The chip implements Single Event Upset (SEU) protection techniques for its digital parts. A first full-size prototype with 64 channels was produced in a commercial 110 nm CMOS technology and the first characterizations of the prototype were performed.

First oxygenated gasoline season shakes out differently than expected

DOE Office of Scientific and Technical Information (OSTI.GOV)

Dale, C.; Hackworth, J.H.; Shore, J.M.

1993-10-25

The U.S.'s first oxygenated gasoline season began Nov. 1, 1992. Refiners and marketers achieved compliance with these new specs with little upset to the gasoline production and distribution system. But although the season went smoothly, it did not shake out exactly as projected. Demand for oxygenated gasoline and, in particular, methyl tertiary butyl ether (MTBE), was lower than expected. Prior to the season, refiners were concerned that oxygenates might be in short supply. No supply shortages developed, however, and prices of both oxygenates and gasoline decreased during the season. The paper discusses gasoline demand, administration of the oxygenated gasoline program,more » spillover, reduced demand, ethanol, oxygenate supply, prices, ethanol tax credit, refinery economics, and the outlook for next season.« less

Development and Flight Test of an Augmented Thrust-Only Flight Control System on an MD-11 Transport Airplane

NASA Technical Reports Server (NTRS)

Burcham, Frank W., Jr.; Maine, Trindel A.; Burken, John J.; Pappas, Drew

1996-01-01

An emergency flight control system using only engine thrust, called Propulsion-Controlled Aircraft (PCA), has been developed and flight tested on an MD-11 airplane. In this thrust-only control system, pilot flight path and track commands and aircraft feedback parameters are used to control the throttles. The PCA system was installed on the MD-11 airplane using software modifications to existing computers. Flight test results show that the PCA system can be used to fly to an airport and safely land a transport airplane with an inoperative flight control system. In up-and-away operation, the PCA system served as an acceptable autopilot capable of extended flight over a range of speeds and altitudes. The PCA approaches, go-arounds, and three landings without the use of any non-nal flight controls have been demonstrated, including instrument landing system-coupled hands-off landings. The PCA operation was used to recover from an upset condition. In addition, PCA was tested at altitude with all three hydraulic systems turned off. This paper reviews the principles of throttles-only flight control; describes the MD-11 airplane and systems; and discusses PCA system development, operation, flight testing, and pilot comments.

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

NASA Technical Reports Server (NTRS)

Berg, Melanie D.; LaBel, Kenneth A.

2018-01-01

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

NASA Technical Reports Server (NTRS)

Berg, Melanie D.; LaBel, Kenneth A.

2018-01-01

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Complex response of a midcontinent north America drainage system to late Wisconsinan sedimentation

USGS Publications Warehouse

Bettis, E. Arthur; Autin, W.J.

1997-01-01

The geomorphic evolution of Mud Creek basin in eastern Iowa, U.S.A. serves to illustrate how geomorphic influences such as sediment supply, valley gradient, climate, and vegetation are recorded in the alluvial stratigraphic record. Sediment supply to the fluvial system increased significantly during the late Wisconsinan through a combination of periglacial erosion and loess accumulation. Subsequent evolution of the Holocene alluvial stratigraphic record reflects long-term routing of the late Wisconsinan sediment through the drainage basin in a series of cut-and-fill cycles whose timing was influenced by hydrologic response to change in climate and vegetation. When viewed in a regional context, the alluvial stratigraphic record appears to reflect a long-term complex response of the fluvial system to increased sediment supply during the late Wisconsinan. Hydrologic and sediment-supply changes accompanying the spread of Euroamerican agriculture to the basin in the 180Os dramatically upset trends in sedimentation and channel behavior established during the Holocene. Copyright ?? 1997, SEPM (Society for Sedimentary Geology).

Manual and automatic flight control during severe turbulence penetration

NASA Technical Reports Server (NTRS)

Johnston, D. E.; Klein, R. H.; Hoh, R. H.

1976-01-01

An analytical and experimental investigation of possible contributing factors in jet aircraft turbulence upsets was conducted. Major contributing factors identified included autopilot and display deficiencies, the large aircraft inertia and associated long response time, and excessive pilot workload. An integrated flight and thrust energy management director system was synthesized. The system was incorporated in a moving-base simulation and evaluated using highly experienced airline pilots. The evaluation included comparison of pilot workload and flight performance during severe turbulence penetration utilizing four control/display concepts: manual control with conventional full panel display, conventional autopilot (A/P-A) with conventional full panel display, improved autopilot (A/P-B) with conventional full panel display plus thrust director display, and longitudinal flight director with conventional full panel display plus thrust director display. Simulation results show improved performance, reduced pilot workload, and a pilot preference for the autopilot system controlling to the flight director command and manual control of thrust following the trim thrust director.

The magnitude and effects of extreme solar particle events

NASA Astrophysics Data System (ADS)

Jiggens, Piers; Chavy-Macdonald, Marc-Andre; Santin, Giovanni; Menicucci, Alessandra; Evans, Hugh; Hilgers, Alain

2014-06-01

The solar energetic particle (SEP) radiation environment is an important consideration for spacecraft design, spacecraft mission planning and human spaceflight. Herein is presented an investigation into the likely severity of effects of a very large Solar Particle Event (SPE) on technology and humans in space. Fluences for SPEs derived using statistical models are compared to historical SPEs to verify their appropriateness for use in the analysis which follows. By combining environment tools with tools to model effects behind varying layers of spacecraft shielding it is possible to predict what impact a large SPE would be likely to have on a spacecraft in Near-Earth interplanetary space or geostationary Earth orbit. Also presented is a comparison of results generated using the traditional method of inputting the environment spectra, determined using a statistical model, into effects tools and a new method developed as part of the ESA SEPEM Project allowing for the creation of an effect time series on which statistics, previously applied to the flux data, can be run directly. The SPE environment spectra is determined and presented as energy integrated proton fluence (cm-2) as a function of particle energy (in MeV). This is input into the SHIELDOSE-2, MULASSIS, NIEL, GRAS and SEU effects tools to provide the output results. In the case of the new method for analysis, the flux time series is fed directly into the MULASSIS and GEMAT tools integrated into the SEPEM system. The output effect quantities include total ionising dose (in rads), non-ionising energy loss (MeV g-1), single event upsets (upsets/bit) and the dose in humans compared to established limits for stochastic (or cancer-causing) effects and tissue reactions (such as acute radiation sickness) in humans given in grey-equivalent and sieverts respectively.

The search for materials to mitigate spacecraft charging

NASA Technical Reports Server (NTRS)

Losure, Nancy S.

1996-01-01

As spacecraft orbit the earth, they encounter a variety of particles and radiation. Charged particles are common enough that a spacecraft can collect substantial charges on its surfaces. If these charges are not bled off, they can accumulate until electrostatic discharges occur between a charged surface and some lower-potential location on the craft. Electrostatic discharge (ESD) is the suspected culprit in a number of spacecraft failures. Silverized Teflon film has become the standard heat-reflecting outer layer of spacecraft because of its flexibility, chemical inertness, and low volatiles content. However, as spacecraft are designed to operate in orbits with greater probability of accumulating enough ions and electrons to create ESD, the Teflon-based thermal control blankets are becoming a liability. Unless stringent (and sometimes burdensome) shielding measures are taken, ESD can upset delicate electronic systems by upsetting or destroying components, interfering with radio signals, garbling internal instructions, and so on. As orbits become higher and more eccentric, as electronics become more sensitive, and as fault-free operation becomes more crucial, it is becoming necessary to find a replacement for silver/Teflon that has comparable strength, flexibility and chemical inertness, as well as a much lower potential for ESD. This is a report of the steps taken toward the goal of selecting a replacement for silver/Teflon during the Summer of 1995. It is a condensation of a much larger report available on request from the author. Three tasks were undertaken. Task 1 was to specify desirable properties for thermal control blankets. The second task was to collect data on materials properties from the literature and organize into a format useful for identifying candidate materials. The third task was to identify candidate materials and begin testing.

Research on on-line monitoring technology for steel ball's forming process based on load signal analysis method

NASA Astrophysics Data System (ADS)

Li, Ying-jun; Ai, Chang-sheng; Men, Xiu-hua; Zhang, Cheng-liang; Zhang, Qi

2013-04-01

This paper presents a novel on-line monitoring technology to obtain forming quality in steel ball's forming process based on load signal analysis method, in order to reveal the bottom die's load characteristic in initial cold heading forging process of steel balls. A mechanical model of the cold header producing process is established and analyzed by using finite element method. The maximum cold heading force is calculated. The results prove that the monitoring on the cold heading process with upsetting force is reasonable and feasible. The forming defects are inflected on the three feature points of the bottom die signals, which are the initial point, infection point, and peak point. A novel PVDF piezoelectric force sensor which is simple on construction and convenient on installation is designed. The sensitivity of the PVDF force sensor is calculated. The characteristics of PVDF force sensor are analyzed by FEM. The PVDF piezoelectric force sensor is fabricated to acquire the actual load signals in the cold heading process, and calibrated by a special device. The measuring system of on-line monitoring is built. The characteristics of the actual signals recognized by learning and identification algorithm are in consistence with simulation results. Identification of actual signals shows that the timing difference values of all feature points for qualified products are not exceed ±6 ms, and amplitude difference values are less than ±3%. The calibration and application experiments show that PVDF force sensor has good static and dynamic performances, and is competent at dynamic measuring on upsetting force. It greatly improves automatic level and machining precision. Equipment capacity factor with damages identification method depends on grade of steel has been improved to 90%.

Flight Test of a Propulsion-Based Emergency Control System on the MD-11 Airplane with Emphasis on the Lateral Axis

NASA Technical Reports Server (NTRS)

Burken, John J.; Burcham, Frank W., Jr.; Maine, Trindel A.; Feather, John; Goldthorpe, Steven; Kahler, Jeffrey A.

1996-01-01

A large, civilian, multi-engine transport MD-11 airplane control system was recently modified to perform as an emergency backup controller using engine thrust only. The emergency backup system, referred to as the propulsion-controlled aircraft (PCA) system, would be used if a major primary flight control system fails. To allow for longitudinal and lateral-directional control, the PCA system requires at least two engines and is implemented through software modifications. A flight-test program was conducted to evaluate the PCA system high-altitude flying characteristics and to demonstrate its capacity to perform safe landings. The cruise flight conditions, several low approaches and one landing without any aerodynamic flight control surface movement, were demonstrated. This paper presents results that show satisfactory performance of the PCA system in the longitudinal axis. Test results indicate that the lateral-directional axis of the system performed well at high attitude but was sluggish and prone to thermal upsets during landing approaches. Flight-test experiences and test techniques are also discussed with emphasis on the lateral-directional axis because of the difficulties encountered in flight test.

What Features Make Online Harassment Incidents Upsetting to Youth?

ERIC Educational Resources Information Center

Mitchell, Kimberly J.; Ybarra, Michele L.; Jones, Lisa M.; Espelage, Dorothy

2016-01-01

This article examines characteristics of online harassment episodes associated with increased distress for youth. Data were collected as part of the Third Youth Internet Safety Survey, a cross-sectional telephone survey conducted in the United States in 2010. Interviews were conducted with 1,560 Internet-using youth, ages 10 through 17. Harassment…

The Challenge of Library Management: Leading with Emotional Engagement

ERIC Educational Resources Information Center

vanDuinkerken, Wyoma; Mosley, Pixey Anne

2011-01-01

Change is inevitable and essential to any functioning institution. But change can be stressful, especially when it upsets established routines and patterns. Library managers need to be able to lead staff through episodes of change while remaining empathetic, and this book shows them how to: (1) Engage library staff in the process and encourage…

Making A D-Latch Sensitive To Alpha Particles

NASA Technical Reports Server (NTRS)

Buehler, Martin G.; Blaes, Brent R.; Nixon, Robert H.

1994-01-01

Standard complementary metal oxide/semiconductor (CMOS) D-latch integrated circuit modified to increase susceptibility to single-event upsets (SEU's) (changes in logic state) caused by impacts of energetic alpha particles. Suitable for use in relatively inexpensive bench-scale SEU tests of itself and of related integrated circuits like static random-access memories.

14 CFR 23.253 - High speed characteristics.

Code of Federal Regulations, 2012 CFR

2012-01-01

... upsets, inadvertent control movements, low stick force gradients in relation to control friction... specified in § 23.1303, it must be shown that the airplane can be recovered to a normal attitude and its... control the airplane for recovery. (c) There may be no control reversal about any axis at any speed up to...

Mobile Technology and the Unsettled Ocean of Student Services

ERIC Educational Resources Information Center

Flood, Tim; Black, Tom

2011-01-01

Mobile technology is one of several currents that upset the relatively placid world of admitting, enrolling, advising, serving, and graduating students. The authors have been involved with technology since they began in the profession. Technology is not really new to them. But with mobile technology, "so much" is new--indeed, foreign--to many…

Interacting with Upset Parents/Guardians: Defending Justice-Oriented Social Studies Lessons in Parent-Teacher Conference Simulations

ERIC Educational Resources Information Center

Brkich, Christopher Andrew; Newkirk, April Cribbs

2015-01-01

Providing middle-grades students the opportunity to engage meaningfully with controversial public issues (CPIs), socioscientific issues (SSIs), or a framework for social justice can be very dangerous work professionally. However, rather than encouraging teacher candidates to eschew controversy, ensuring they receive sufficient training in how to…

Try the Guillotine

ERIC Educational Resources Information Center

Mahon, Robert Lee

2006-01-01

Recent articles from the "Atlantic Monthly" to "Newsweek", have identified plagiarism as an issue now on the educational front burner. Academics and teachers in all areas seem to be upset about the numbers of students who are not writing their own papers. In this article, the author, describes strategies, he has used in his class for minimizing,…

40 CFR 60.101 - Definitions.

Code of Federal Regulations, 2011 CFR

2011-07-01

... crude oil removed from the earth and the oils derived from tar sands, shale, and coal. (c) Process gas means any gas generated by a petroleum refinery process unit, except fuel gas and process upset gas as defined in this section. (d) Fuel gas means any gas which is generated at a petroleum refinery and which...

40 CFR 60.101 - Definitions.

Code of Federal Regulations, 2013 CFR

2013-07-01

... crude oil removed from the earth and the oils derived from tar sands, shale, and coal. (c) Process gas means any gas generated by a petroleum refinery process unit, except fuel gas and process upset gas as defined in this section. (d) Fuel gas means any gas which is generated at a petroleum refinery and which...

40 CFR 60.101 - Definitions.

Code of Federal Regulations, 2012 CFR

2012-07-01

... crude oil removed from the earth and the oils derived from tar sands, shale, and coal. (c) Process gas means any gas generated by a petroleum refinery process unit, except fuel gas and process upset gas as defined in this section. (d) Fuel gas means any gas which is generated at a petroleum refinery and which...

40 CFR 60.101 - Definitions.

Code of Federal Regulations, 2014 CFR

2014-07-01

... crude oil removed from the earth and the oils derived from tar sands, shale, and coal. (c) Process gas means any gas generated by a petroleum refinery process unit, except fuel gas and process upset gas as defined in this section. (d) Fuel gas means any gas which is generated at a petroleum refinery and which...

Effects of cosmic rays on single event upsets

NASA Technical Reports Server (NTRS)

Lowe, Calvin W.; Oladipupo, Adebisi O.; Venable, Demetrius D.

1988-01-01

The efforts at establishing a research program in space radiation effects are discussed. The research program has served as the basis for training several graduate students in an area of research that is of importance to NASA. In addition, technical support was provided for the Single Event Facility Group at Brookhaven National Laboratory.

Test results for SEU and SEL immune memory circuits

NASA Technical Reports Server (NTRS)

Wiseman, D.; Canaris, J.; Whitaker, S.; Gambles, J.; Arave, K.; Arave, L.

1993-01-01

Test results for three SEU logic/circuit hardened CMOS memory circuits verify upset and latch-up immunity for two configurations to be in excess of 120 MeV cm(exp 2)/mg using a commercial, non-radiation hardened CMOS process. Test chips from three separate fabrication runs in two different process were evaluated.

Tourist Opinions on Animal Culling: A South Australian Example

ERIC Educational Resources Information Center

Moskwa, Emily C.

2015-01-01

Environmental education is commonly used to satisfy the natural curiosity of tourists, increase conservation awareness and strengthen pro-conservation values. Yet it does not always address the more sensitive ecosystem management issues such as animal culling as it may be seen to upset the balance of the positive tourist experience. For this…

Effects of roughage inclusion and particle size on performance and rumination behavior of finishing beef steers

USDA-ARS?s Scientific Manuscript database

Roughage is mechanically processed to increase digestibility, and handling and mixing characteristics in finishing diets. Roughage is fed to promote rumen health and decrease digestive upset, but inclusion in finishing diets is limited due to the cost per unit of energy. Rumination behavior may be a...

Taming Disruptive Technologies, or How To Remain Relevant in the Digital Age.

ERIC Educational Resources Information Center

Blackwell, Philip

2001-01-01

Discusses electronic books as a disruptive technology, that is, a technology that has appeal to its users but upsets the traditional models. Highlights include a history of print technology; types of electronic books; reader devices; stakeholders, including users, librarians, and publishers; and how vendors can remain relevant. (LRW)

Global warming and house fly control: direct effects and biodiversity concerns.

USDA-ARS?s Scientific Manuscript database

House flies are major pests of human and animal health throughout the world and are among the most difficult to control. Effective fly management relies on a balance of sanitation, insecticide use, and biological control. Climate change could upset that balance in favor of the fly unless pro-activ...

Cosmic ray heavy ion LET mapping for aluminum, silicon, and tissue targets

NASA Technical Reports Server (NTRS)

Stassinopoulos, E. G.; Barth, J. M.; Jordan, T. M.

1987-01-01

Linear energy transfer (LET) values in aluminum, silicon, and tissue targets have been calculated for 31 galactic cosmic ray ion species in eight different units. The values are described for single event upset (SEU) effect assessments or radiobiological evaluations. The data are presented in graphical and tabular form.

Effect of Forewarning on Emotional Responses to a Horror Film.

ERIC Educational Resources Information Center

Cantor, Joanne; And Others

1984-01-01

Describes a study which used the heart rate of subjects as the measure of physiological arousal to assess the effect of forewarning on emotional reactions and physiological responses to a frightening television film. Results indicate that although forewarning did not significantly affect anxiety, it did promote more intense fright and upset. (MBR)

What You See Is Not What You Get

ERIC Educational Resources Information Center

White-McMahon, Meredith

2010-01-01

When upset, 15-year-old Peter overreacts, dumping verbal hostility on everyone, even those trying to help. Peter's attempt to see the principal--who was out of the office--led to an emotionally explosive crisis. In this life space crisis intervention (LSCI), staff calmly tried to help Peter clarify distorted reality. But patient questioning raised…

Better to matter than merely count.

PubMed

Hay, N

1989-07-01

when at the age of 42 I gave up my accountancy job in a City bank and became a student nurse at one sixth of the salary I upset the material expectations of a lot of people. But it was money, the symbol of security for so many, that was partly the cause of my undoing.

Investigating Level of Mathematics Knowledge for Students Attending Vocational Schools in Turkey

ERIC Educational Resources Information Center

Colakoglu, Nurdan

2013-01-01

Students attend mathematics courses in Turkey for totally 11 years, throughout education life ranging from primary school to university, including eight years in primary education and three years in secondary education (four years based on new arrangement); however, level of mathematic knowledge of students is upsetting when they reach university…

Dying and Death: Helping Children Cope.

ERIC Educational Resources Information Center

Ledezma, Melissa L.

This paper suggests strategies for helping children understand death. The early experiences of childhood build the foundation on which the child establishes a healthy orientation towards life and living. Grieving parents are often so upset by their own loss that they do not carefully explain death to their children. Parents may feel that the child…

Publishers' PR Tactic Angers University Presses and Open-Access Advocates

ERIC Educational Resources Information Center

Howard, Jennifer

2007-01-01

This article reports on reactions to the Association of American Publishers' new public-relations campaign, which has upset many university presses and research librarians, as well as open-access advocates. The effort, known as the "Partnership for Research Integrity in Science & Medicine," or Prism, is the latest tactic in a continuing…

Peer sexual harassment and disordered eating in early adolescence.

PubMed

Petersen, Jennifer L; Hyde, Janet S

2013-01-01

Peer sexual harassment is a pervasive problem in schools and is associated with a variety of negative mental health outcomes. Objectification theory suggests that sexual attention in the form of peer harassment directs unwanted attention to the victim's body and may lead to a desire to alter the body via disordered eating. In the current study, we used latent growth modeling with a sample of 406 U.S. adolescents to examine the relationship between longitudinal trends in peer sexual harassment from 5th to 9th grade and disordered eating in 9th grade. Longitudinal trends in self-surveillance were proposed as a mediator of the relationships. Results indicated that the relationship between upsetting sexual harassment at 5th grade and disordered eating symptoms at 9th grade was mediated by self-surveillance at 5th grade. Girls reported more upsetting sexual harassment, more self-surveillance, and thus more disordered eating than boys did. These results are in accord with objectification theory, which proposes that sexual harassment is a form of sexual objectification and may lead to self-surveillance and disordered eating.

Radiation response issues for infrared detectors

NASA Technical Reports Server (NTRS)

Kalma, Arne H.

1990-01-01

Researchers describe the most important radiation response issues for infrared detectors. In general, the two key degradation mechanisms in infrared detectors are the noise produced by exposure to a flux of ionizing particles (e.g.; trapped electronics and protons, debris gammas and electrons, radioactive decay of neutron-activated materials) and permanent damage produced by exposure to total dose. Total-dose-induced damage is most often the result of charge trapping in insulators or at interfaces. Exposure to short pulses of ionization (e.g.; prompt x rays or gammas, delayed gammas) will cause detector upset. However, this upset is not important to a sensor unless the recovery time is too long. A few detector technologies are vulnerable to neutron-induced displacement damage, but fortunately most are not. Researchers compare the responses of the new technologies with those of the mainstream technologies of PV HgCdTe and IBC Si:As. One important reason for this comparison is to note where some of the newer technologies have the potential to provide significantly improved radiation hardness compared with that of the mainstream technologies, and thus to provide greater motivation for the pursuit of these technologies.

Radiation-hardened MRAM-based LUT for non-volatile FPGA soft error mitigation with multi-node upset tolerance

NASA Astrophysics Data System (ADS)

Zand, Ramtin; DeMara, Ronald F.

2017-12-01

In this paper, we have developed a radiation-hardened non-volatile lookup table (LUT) circuit utilizing spin Hall effect (SHE)-magnetic random access memory (MRAM) devices. The design is motivated by modeling the effect of radiation particles striking hybrid complementary metal oxide semiconductor/spin based circuits, and the resistive behavior of SHE-MRAM devices via established and precise physics equations. The models developed are leveraged in the SPICE circuit simulator to verify the functionality of the proposed design. The proposed hardening technique is based on using feedback transistors, as well as increasing the radiation capacity of the sensitive nodes. Simulation results show that our proposed LUT circuit can achieve multiple node upset (MNU) tolerance with more than 38% and 60% power-delay product improvement as well as 26% and 50% reduction in device count compared to the previous energy-efficient radiation-hardened LUT designs. Finally, we have performed a process variation analysis showing that the MNU immunity of our proposed circuit is realized at the cost of increased susceptibility to transistor and MRAM variations compared to an unprotected LUT design.

Microbeam mapping of single event latchups and single event upsets in CMOS SRAMs

DOE Office of Scientific and Technical Information (OSTI.GOV)

Barak, J.; Adler, E.; Fischer, B.E.

1998-06-01

The first simultaneous microbeam mapping of single event upset (SEU) and latchup (SEL) in the CMOS RAM HM65162 is presented. The authors found that the shapes of the sensitive areas depend on V{sub DD}, on the ions being used and on the site on the chip being hit by the ion. In particular, they found SEL sensitive sites close to the main power supply lines between the memory-bit-arrays by detecting the accompanying current surge. All these SELs were also accompanied by bit-flips elsewhere in the memory (which they call indirect SEUs in contrast to the well known SEUs induced inmore » the hit memory cell only). When identical SEL sensitive sites were hit farther away from the supply lines only indirect SEL sensitive sites could be detected. They interpret these events as latent latchups in contrast to the classical ones detected by their induced current surge. These latent SELs were probably decoupled from the main supply lines by the high resistivity of the local supply lines.« less

An advanced SEU tolerant latch based on error detection

NASA Astrophysics Data System (ADS)

Xu, Hui; Zhu, Jianwei; Lu, Xiaoping; Li, Jingzhao

2018-05-01

This paper proposes a latch that can mitigate SEUs via an error detection circuit. The error detection circuit is hardened by a C-element and a stacked PMOS. In the hold state, a particle strikes the latch or the error detection circuit may cause a fault logic state of the circuit. The error detection circuit can detect the upset node in the latch and the fault output will be corrected. The upset node in the error detection circuit can be corrected by the C-element. The power dissipation and propagation delay of the proposed latch are analyzed by HSPICE simulations. The proposed latch consumes about 77.5% less energy and 33.1% less propagation delay than the triple modular redundancy (TMR) latch. Simulation results demonstrate that the proposed latch can mitigate SEU effectively. Project supported by the National Natural Science Foundation of China (Nos. 61404001, 61306046), the Anhui Province University Natural Science Research Major Project (No. KJ2014ZD12), the Huainan Science and Technology Program (No. 2013A4011), and the National Natural Science Foundation of China (No. 61371025).

Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code

NASA Astrophysics Data System (ADS)

Reed, Robert A.; Weller, Robert A.; Mendenhall, Marcus H.; Fleetwood, Daniel M.; Warren, Kevin M.; Sierawski, Brian D.; King, Michael P.; Schrimpf, Ronald D.; Auden, Elizabeth C.

2015-08-01

MRED is a Python-language scriptable computer application that simulates radiation transport. It is the computational engine for the on-line tool CRÈME-MC. MRED is based on c++ code from Geant4 with additional Fortran components to simulate electron transport and nuclear reactions with high precision. We provide a detailed description of the structure of MRED and the implementation of the simulation of physical processes used to simulate radiation effects in electronic devices and circuits. Extensive discussion and references are provided that illustrate the validation of models used to implement specific simulations of relevant physical processes. Several applications of MRED are summarized that demonstrate its ability to predict and describe basic physical phenomena associated with irradiation of electronic circuits and devices. These include effects from single particle radiation (including both direct ionization and indirect ionization effects), dose enhancement effects, and displacement damage effects. MRED simulations have also helped to identify new single event upset mechanisms not previously observed by experiment, but since confirmed, including upsets due to muons and energetic electrons.

Single Event Effects Test Results for Advanced Field Programmable Gate Arrays

NASA Technical Reports Server (NTRS)

Allen, Gregory R.; Swift, Gary M.

2006-01-01

Reconfigurable Field Programmable Gate Arrays (FPGAs) from Altera and Actel and an FPGA-based quick-turnApplication Specific Integrated Circuit (ASIC) from Altera were subjected to single-event testing using heavy ions. Both Altera devices (Stratix II and HardCopy II) exhibited a low latchup threshold (below an LET of 3 MeV-cm2/mg) and thus are not recommended for applications in the space radiation environment. The flash-based Actel ProASIC Plus device did not exhibit latchup to an effective LET of 75 MeV-cm2/mg at room temperature. In addition, these tests did not show flash cell charge loss (upset) or retention damage. Upset characterization of the design-level flip-flops yielded an LET threshold below 10 MeV-cm2/mg and a high LET cross section of about lxlO-6 cm2/bit for storing ones and about lxl0-7 cm2/bit for storing zeros . Thus, the ProASIC device may be suitable for critical flight applications with appropriate triple modular redundancy mitigation techniques.

Anomalous annealing of floating gate errors due to heavy ion irradiation

NASA Astrophysics Data System (ADS)

Yin, Yanan; Liu, Jie; Sun, Youmei; Hou, Mingdong; Liu, Tianqi; Ye, Bing; Ji, Qinggang; Luo, Jie; Zhao, Peixiong

2018-03-01

Using the heavy ions provided by the Heavy Ion Research Facility in Lanzhou (HIRFL), the annealing of heavy-ion induced floating gate (FG) errors in 34 nm and 25 nm NAND Flash memories has been studied. The single event upset (SEU) cross section of FG and the evolution of the errors after irradiation depending on the ion linear energy transfer (LET) values, data pattern and feature size of the device are presented. Different rates of annealing for different ion LET and different pattern are observed in 34 nm and 25 nm memories. The variation of the percentage of different error patterns in 34 nm and 25 nm memories with annealing time shows that the annealing of FG errors induced by heavy-ion in memories will mainly take place in the cells directly hit under low LET ion exposure and other cells affected by heavy ions when the ion LET is higher. The influence of Multiple Cell Upsets (MCUs) on the annealing of FG errors is analyzed. MCUs with high error multiplicity which account for the majority of the errors can induce a large percentage of annealed errors.

Multi-physics modelling contributions to investigate the atmospheric cosmic rays on the single event upset sensitivity along the scaling trend of CMOS technologies.

PubMed

Hubert, G; Regis, D; Cheminet, A; Gatti, M; Lacoste, V

2014-10-01

Particles originating from primary cosmic radiation, which hit the Earth's atmosphere give rise to a complex field of secondary particles. These particles include neutrons, protons, muons, pions, etc. Since the 1980s it has been known that terrestrial cosmic rays can penetrate the natural shielding of buildings, equipment and circuit package and induce soft errors in integrated circuits. Recently, research has shown that commercial static random access memories are now so small and sufficiently sensitive that single event upsets (SEUs) may be induced from the electronic stopping of a proton. With continued advancements in process size, this downward trend in sensitivity is expected to continue. Then, muon soft errors have been predicted for nano-electronics. This paper describes the effects in the specific cases such as neutron-, proton- and muon-induced SEU observed in complementary metal-oxide semiconductor. The results will allow investigating the technology node sensitivity along the scaling trend. © The Author 2014. Published by Oxford University Press. All rights reserved. For Permissions, please email: journals.permissions@oup.com.

Clinical utility of the impact of event scale: psychometrics in the general population.

PubMed

Briere, J; Elliott, D M

1998-06-01

The Impact of Event Scale (IES; Horowitz, Wilner, & Alvarez, 1979), Trauma Symptom Inventory (TSI; Briere, 1995), Los Angeles Symptom Checklist (LASC; Foy, Sipprelle, Rueger, & Carroll, 1984), and Traumatic Events Survey (TES; Elliott, 1992) were administered to a sample of 505 participants from the general population. In this application of the IES, participants reported on "an upsetting event," as opposed to a specific stressor. The IES was found to be reliable and to have concurrent validity with respect to the TSI and LASC. IES scores varied as a function of race, but this relationship disappeared once race differences in exposure to potentially traumatic events (PTEs) were taken into account. Although the IES was predictive of PTEs, the traumatic stress scales of the TSI had more predictive and incremental validity than the IES. The current data suggest that an "upsetting event" version of the IES may be useful as a brief screen for nonarousal-related posttraumatic stress, but that its potential limitations should be taken into account. Normative data on this version of the IES are presented.

A Novel Application of Machine Learning Methods to Model Microcontroller Upset Due to Intentional Electromagnetic Interference

NASA Astrophysics Data System (ADS)

Bilalic, Rusmir

A novel application of support vector machines (SVMs), artificial neural networks (ANNs), and Gaussian processes (GPs) for machine learning (GPML) to model microcontroller unit (MCU) upset due to intentional electromagnetic interference (IEMI) is presented. In this approach, an MCU performs a counting operation (0-7) while electromagnetic interference in the form of a radio frequency (RF) pulse is direct-injected into the MCU clock line. Injection times with respect to the clock signal are the clock low, clock rising edge, clock high, and the clock falling edge periods in the clock window during which the MCU is performing initialization and executing the counting procedure. The intent is to cause disruption in the counting operation and model the probability of effect (PoE) using machine learning tools. Five experiments were executed as part of this research, each of which contained a set of 38,300 training points and 38,300 test points, for a total of 383,000 total points with the following experiment variables: injection times with respect to the clock signal, injected RF power, injected RF pulse width, and injected RF frequency. For the 191,500 training points, the average training error was 12.47%, while for the 191,500 test points the average test error was 14.85%, meaning that on average, the machine was able to predict MCU upset with an 85.15% accuracy. Leaving out the results for the worst-performing model (SVM with a linear kernel), the test prediction accuracy for the remaining machines is almost 89%. All three machine learning methods (ANNs, SVMs, and GPML) showed excellent and consistent results in their ability to model and predict the PoE on an MCU due to IEMI. The GP approach performed best during training with a 7.43% average training error, while the ANN technique was most accurate during the test with a 10.80% error.

Soft-error tolerance and energy consumption evaluation of embedded computer with magnetic random access memory in practical systems using computer simulations

NASA Astrophysics Data System (ADS)

Nebashi, Ryusuke; Sakimura, Noboru; Sugibayashi, Tadahiko

2017-08-01

We evaluated the soft-error tolerance and energy consumption of an embedded computer with magnetic random access memory (MRAM) using two computer simulators. One is a central processing unit (CPU) simulator of a typical embedded computer system. We simulated the radiation-induced single-event-upset (SEU) probability in a spin-transfer-torque MRAM cell and also the failure rate of a typical embedded computer due to its main memory SEU error. The other is a delay tolerant network (DTN) system simulator. It simulates the power dissipation of wireless sensor network nodes of the system using a revised CPU simulator and a network simulator. We demonstrated that the SEU effect on the embedded computer with 1 Gbit MRAM-based working memory is less than 1 failure in time (FIT). We also demonstrated that the energy consumption of the DTN sensor node with MRAM-based working memory can be reduced to 1/11. These results indicate that MRAM-based working memory enhances the disaster tolerance of embedded computers.

DOE Office of Scientific and Technical Information (OSTI.GOV)

Chemerisov, S.; Bailey, J.; Heltemes, T.

A series of four one-day irradiations was conducted with 100Mo-enriched disk targets. After irradiation, the enriched disks were removed from the target and dissolved. The resulting solution was processed using a NorthStar RadioGenix™ 99mTc generator either at Argonne National Laboratory or at the NorthStar Medical Radioisotopes facility. Runs on the RadioGenix system produced inconsistent analytical results for 99mTc in the Tc/Mo solution. These inconsistencies were attributed to the impurities in the solution or improper column packing. During the irradiations, the performance of the optic transitional radiation (OTR) and infrared cameras was tested in high radiation field. The OTR cameras survivedmore » all irradiations, while the IR cameras failed every time. The addition of X-ray and neutron shielding improved camera survivability and decreased the number of upsets.« less

[Physiological basis of survival and rehabilitation of the residents of blockaded Leningrad].

PubMed

Magaeva, S V; Simonenko, V B

2012-01-01

The authors attribute survival of certain residents of blockaded Leningrad under conditions ofcomplete starvation to activation of natural sanologic mechanisms of the body. Physiological psychoemotional stress is supposed to contribute to the formation of prerequisites for survival during subsequent starvation. Also, the survival is believed to be related to selected activation of apoptosis of renewable cells and utilization of their constituents in endogenous nutrition. The role of priority energetic and trophic support of brain and kidneys and the contribution of the psychosomatic factor are postulated. The mechanisms of rehabilitation after upset of vital activity involve partial reversibility of atrophic and metabolic processes and neural regulation of organs and their systems. The importance of the study of activation of natural sanologic mechanisms in extreme conditions is discussed

Review of Research On Angle-of-Attack Indicator Effectiveness

NASA Technical Reports Server (NTRS)

Le Vie, Lisa R.

2014-01-01

The National Aeronautics and Space Administration (NASA) conducted a literature review to determine the potential benefits of a display of angle-of-attack (AoA) on the flight deck of commercial transport that may aid a pilot in energy state awareness, upset recovery, and/or diagnosis of air data system failure. This literature review encompassed an exhaustive list of references available and includes studies on the benefits of displaying AoA information during all phases of flight. It also contains information and descriptions about various AoA indicators such as dial, vertical and horizontal types as well as AoA displays on the primary flight display and the head up display. Any training given on the use of an AoA indicator during the research studies or experiments is also included for review

Application of a Model for Simulating the Vacuum Arc Remelting Process in Titanium Alloys

NASA Astrophysics Data System (ADS)

Patel, Ashish; Tripp, David W.; Fiore, Daniel

Mathematical modeling is routinely used in the process development and production of advanced aerospace alloys to gain greater insight into system dynamics and to predict the effect of process modifications or upsets on final properties. This article describes the application of a 2-D mathematical VAR model presented in previous LMPC meetings. The impact of process parameters on melt pool geometry, solidification behavior, fluid-flow and chemistry in Ti-6Al-4V ingots will be discussed. Model predictions were first validated against the measured characteristics of industrially produced ingots, and process inputs and model formulation were adjusted to match macro-etched pool shapes. The results are compared to published data in the literature. Finally, the model is used to examine ingot chemistry during successive VAR melts.

Science Ethics Rules Leave Room for Scandals, Critics Fear

ERIC Educational Resources Information Center

Basken, Paul

2009-01-01

Upset because the University of California at Davis did not support her charges of misconduct among scientists, Melinda M. Zaragoza left her career in microbiology to run a general store in Kentucky. Although no wrongdoing was found on the Davis campus, Ms. Zaragoza's whistle-blowing now is being joined by a powerful chorus. Officials of the…

Single Event Effect Testing of the Micron MT46V128M8

NASA Technical Reports Server (NTRS)

Stansberry, Scott; Campola, Michael; Wilcox, Ted; Seidleck, Christina; Phan, Anthony

2017-01-01

The Micron MT46V128M8 was tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in June of 2017. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI) and possible soft data errors classified as single event upsets (SEU).

Perceptions of International Teacher Turnover in East Asia Regional Council of Schools

ERIC Educational Resources Information Center

Tkachyk, Leon Michael

2017-01-01

High teacher turnover has become a serious problem globally, in many international schools, and is a growing concern in segments of the East Asia Regional Council of Schools (EARCOS). This persistent problem has a detrimental effect on student learning and upsets the culture of school communities. Herzberg's motivation-hygiene theory served as the…

The Relation between Disinhibition and Emotion Regulation in Boys with Attention Deficit Hyperactivity Disorder

ERIC Educational Resources Information Center

Walcott, Christy Mangione; Landau, Steven

2004-01-01

This study examined group differences of 49 boys ages 6 to 11 years with and without attention deficit hyperactivity disorder (ADHD) in emotion regulation during frustrating peer competition. Half of all boys in each group were explicitly instructed to hide their feelings if they became upset during the competition. Behavioral inhibition, both…

Diversity and Inclusion in Social Media: A Case Study of Student Behavior

ERIC Educational Resources Information Center

Daugird, Debra; Everett, Marlena; Jones, Mary; Lewis, Lisa; White, Angela

2015-01-01

A freshman student posts on her social media account remarks that reflect intolerance and bigotry. Fellow students and faculty are upset, and disciplinary action follows. Was the student's right to free speech ignored or were the rights of others to a welcoming and inclusive environment infringed upon? This case guides the reader through some of…

Truth-telling in clinical practice.

PubMed Central

Hébert, P. C.

1994-01-01

Disclosure by doctors to patients has changed during the past 30 years in the direction of honesty, but deception and nondisclosure are still common. Clear ethical and legal precedents and guidelines regarding truth-telling exist. Physicians should not protect patients from potentially upsetting information; they will be held responsible should patients be injured due to failure to disclose. PMID:7888823

Childhood Fears and Worries: Opening the Doors to Conversation

ERIC Educational Resources Information Center

Schreiber, Jean

2012-01-01

Although parents may try to shield their children from information that may be upsetting to them, inevitably they will be exposed to life's challenges and painful realities. People live in the "information age" and children are frequently bombarded with overwhelming news from the media. Since children are very aware of the emotions of the adults…

An Examination of Year-Round Education: Pros and Cons That Challenge Schooling in America.

ERIC Educational Resources Information Center

Howell, Vicki T.

The idea of converting to year-round education (YRE) comes from different sources, such as communities concerned about idle youth and taxpayer groups upset about empty buildings during the summer. The most prevalent reasons are overcrowded schools and unavailable construction funds, due to failed school bond proposals or refusal to raise taxes.…

Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

NASA Technical Reports Server (NTRS)

Berg, M.; Buchner, S.; Kim, H.; Friendlich, M.; Perez, C.; Phan, A.; Seidleck, C.; LaBel, K.; Kruckmeyer, K.

2010-01-01

A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss.

Bevalac Ion Beam Characterizations for Single Event Phenomena

DTIC Science & Technology

1992-07-16

site. 13 REFERENCES 1. T. L. Criswell, P. R. Measel and K. L. Wablin, "Single Event Upset Testing with Relativistic Heavy Ions," IEEE Trans. Nucl. Sci...NS-31, 1559-1563, (1984). 2. T. L. Criswell, D. L. Oberg, J. L. Wert, P. R. Measel , and W. E. Wilson, "Measurement of SEU Thresholds and Cross

Defect-sensitivity analysis of an SEU immune CMOS logic family

NASA Technical Reports Server (NTRS)

Ingermann, Erik H.; Frenzel, James F.

1992-01-01

Fault testing of resistive manufacturing defects is done on a recently developed single event upset immune logic family. Resistive ranges and delay times are compared with those of traditional CMOS logic. Reaction of the logic to these defects is observed for a NOR gate, and an evaluation of its ability to cope with them is determined.

40 CFR 63.11412 - What definitions apply to this subpart?

Code of Federal Regulations, 2011 CFR

2011-07-01

...: Chromium Compounds Other Requirements and Information § 63.11412 What definitions apply to this subpart? Terms used in this subpart are defined in the CAA, in 40 CFR 63.2, and in this section as follows: Bag... matter (dust loadings) in the exhaust of a baghouse to detect bag leaks and other upset conditions. A bag...

40 CFR 63.11412 - What definitions apply to this subpart?

Code of Federal Regulations, 2010 CFR

2010-07-01

...: Chromium Compounds Other Requirements and Information § 63.11412 What definitions apply to this subpart? Terms used in this subpart are defined in the CAA, in 40 CFR 63.2, and in this section as follows: Bag... matter (dust loadings) in the exhaust of a baghouse to detect bag leaks and other upset conditions. A bag...

Upper-Bound Estimates Of SEU in CMOS

NASA Technical Reports Server (NTRS)

Edmonds, Larry D.

1990-01-01

Theory of single-event upsets (SEU) (changes in logic state caused by energetic charged subatomic particles) in complementary metal oxide/semiconductor (CMOS) logic devices extended to provide upper-bound estimates of rates of SEU when limited experimental information available and configuration and dimensions of SEU-sensitive regions of devices unknown. Based partly on chord-length-distribution method.

Effects on roughage inclusion and particle size on digestion and ruminal fermentation characteristics of beef steers

USDA-ARS?s Scientific Manuscript database

Roughage is fed to cattle to promote ruminal health and decrease digestive upset, but inclusion in finishing diets is limited due to the cost per unit of energy. Rumination behavior may be a means to standardize roughage in beef cattle finishing diets, and increasing particle size of roughage could ...

Towards a Rhetoric of On-line Tutoring.

ERIC Educational Resources Information Center

Coogan, David

Electronic mail-based tutoring of undergraduate writing students upsets the temporal basis of the face-to-face paradigm for writing tutorials. Taking place in real time in a specified place, the face-to-face tutorial session has a beginning, middle and end. Further, the session must have a tangible point. By contrast, in on-line tutoring, time is…

Who Helps You? Self and Other Sources of Support among Youth in Japan and the USA

ERIC Educational Resources Information Center

Crystal, David S.; Kakinuma, Miki; DeBell, Matthew; Azuma, Hiroshi; Miyashita, Takahiro

2008-01-01

Japanese and U.S. sixth, eighth, and tenth graders (N = 2141) responded to questionnaires asking whom they depended on in six contexts of need. These contexts were: morning awakening, physical illness, emotional upset, help with homework, causing a problem, and guidance in extracurricular activities. Findings indicated that, relative to culture,…

Between Teacher & Parent

ERIC Educational Resources Information Center

Brodkin, Adele M.

2007-01-01

In this article, the author discusses how a new afterschool arrangement is upsetting a 4-year-old child named Mackenzie. Her babysitter left last week, just as her mom started a new job with longer hours. She is missing her former caregiver and mom a lot. Based on the stories from her teacher and her father, the author gives her assessment of…

Diversity Work in Contentious Times: The Role of The Chief Diversity Officer

ERIC Educational Resources Information Center

Wong, Kathleen

2017-01-01

Following the 2016 presidential election, the author, the chief diversity officer at San José State University (SJSU), began receiving calls from professors who were anxious about facilitating discussions in their classrooms. At SJSU, a significant number of students were upset by--and fearful about-- incidents of hate and harassment nationwide,…

A one-day couple group intervention to enhance sexual recovery for surgically treated men with prostate cancer and their partners: a pilot study.

PubMed

Wittmann, Daniela; He, Chang; Mitchell, Staci; Wood, David P; Hola, Victor; Thelen-Perry, Steve; Montie, James E

2013-01-01

Researchers evaluated the acceptance and effectiveness of a group intervention that provided education about post-prostatectomy sexual recovery and peer support for couples. Couples valued the intervention and retained the information. Partners became accepting of erectile dysfunction and communicated more openly about upsetting topics.

Facing the Unknown: Intolerance of Uncertainty in Children with Autism Spectrum Disorder

ERIC Educational Resources Information Center

Hodgson, Anna R.; Freeston, Mark H.; Honey, Emma; Rodgers, Jacqui

2017-01-01

Background: Anxiety is a common problem for children with autism spectrum disorder (ASD). Recent research indicates that intolerance of uncertainty (IU) may be an important aspect of anxiety for this population. IU is the belief that uncertainty is upsetting, and not knowing what is going to happen is negative. There is little known about the…

Impact of Making Textile Handcrafts on Mood Enhancement and Inflammatory Immune Changes

ERIC Educational Resources Information Center

Futterman Collier, Ann D.; Wayment, Heidi A.; Birkett, Melissa

2016-01-01

The authors hypothesized that a textile art-making activity that was high in arousal, engagement, and positive mood and low in rumination and negative affect would be most effective for mood repair and would buffer inflammatory immune reactions. Forty-seven experienced textile handcrafters were asked to recall an upsetting situation before random…

Personal Reflections of Comfort and Upset Moments in Leadership Journey

ERIC Educational Resources Information Center

Loisulie, Paul

2017-01-01

Leadership is one of the key factors for development of all organizations be they small or large. This study describes the feelings and thinking of the author on leadership aspects basing on his own practical experiences from being a University of Dodoma Academic Staff Association's Leader. The author was elected as a chairperson of the University…

GRAIN REFINEMENT OF URANIUM BILLETS

DOEpatents

Lewis, L.

1964-02-25

A method of refining the grain structure of massive uranium billets without resort to forging is described. The method consists in the steps of beta- quenching the billets, annealing the quenched billets in the upper alpha temperature range, and extrusion upset of the billets to an extent sufficient to increase the cross sectional area by at least 5 per cent. (AEC)

From Belligerence to Peace: The Role of Civic Education.

ERIC Educational Resources Information Center

Benporath, Sigal R.

When a security threat and sense of instability befell the United States after the events of September 11, 2001, the familiar order of political priorities was upset. In a matter of days the American public discourse organized itself around the same principles that have guided the state of Israel for many years: security IN, education OUT.…

Microcircuit radiation effects databank

NASA Technical Reports Server (NTRS)

1983-01-01

Radiation test data submitted by many testers is collated to serve as a reference for engineers who are concerned with and have some knowledge of the effects of the natural radiation environment on microcircuits. Total dose damage information and single event upset cross sections, i.e., the probability of a soft error (bit flip) or of a hard error (latchup) are presented.

33 CFR 154.2022 - Certification, recertification, or operational review-certifying entity responsibilities, generally.

Code of Federal Regulations, 2014 CFR

2014-07-01

... alarm and shutdown shown on the piping and instrumentation diagrams (P&IDs) and reviewed in the hazard... cleaning facility; and that (5) The automatic liquid block valve successfully stops flow of liquid to the... automatically stop the cargo flow to each transfer hose simultaneously, in the event an upset condition occurs...

Courage under Fire: Duval County's School Board Chair Faces a Major Leadership Challenge

ERIC Educational Resources Information Center

Fossey, Richard; Jenkins, Lynn

2011-01-01

This case set in Jacksonville, Florida, covers the years 1998 to 2001. A new nontraditional superintendent, Major General John C. Fryer, focuses on student achievement, but financial needs and Florida law require him to bid contracts for student transportation, upsetting a 50-year pattern of contracting without competitive bidding with more than…

The Linkage between Secondary Victimization by Law Enforcement and Rape Case Outcomes

ERIC Educational Resources Information Center

Patterson, Debra

2011-01-01

Prior research has suggested that almost half of rape victims are treated by law enforcement in ways that they experience as upsetting (termed "secondary victimization"). However, it remains unknown why some victims have negative experiences with law enforcement and others do not. The purpose of this study is to explore victims' experiences with…