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Sample records for r-plane sapphire substrates

  1. Growth kinetics of AlN and GaN films grown by molecular beam epitaxy on R-plane sapphire substrates

    SciTech Connect

    Chandrasekaran, R.; Moustakas, T. D.; Ozcan, A. S.; Ludwig, K. F.; Zhou, L.; Smith, David J.

    2010-08-15

    This paper reports the growth by molecular beam epitaxy of AlN and GaN thin films on R-plane sapphire substrates. Contrary to previous findings that GaN grows with its (1120) A-plane parallel to the (1102) R-plane of sapphire, our results indicate that the crystallographic orientation of the III-nitride films is strongly dependent on the kinetic conditions of growth for the GaN or AlN buffer layers. Thus, group III-rich conditions for growth of either GaN or AlN buffers result in nitride films having (1120) planes parallel to the sapphire surface, and basal-plane stacking faults parallel to the growth direction. The growth of these buffers under N-rich conditions instead leads to nitride films with (1126) planes parallel to the sapphire surface, with inclined c-plane stacking faults that often terminate threading dislocations. Moreover, electron microscope observations indicate that slight miscut ({approx}0.5 deg. ) of the R-plane sapphire substrate almost completely suppresses the formation of twinning defects in the (1126) GaN films.

  2. Effects of precursor concentration on the properties of ZnO nanowires grown on (1-102) r-plane sapphire substrates by hydrothermal synthesis.

    PubMed

    Mun, D-H; Bak, S J; Ha, J-S; Lee, H-J; Lee, J K; Lee, S H; Moon, Y B

    2014-08-01

    In this study, we grew ZnO nanowires hydrothermally on (1-102) r-plane sapphire substrates in an aqueous solution which contained zinc nitrate hexahydrate and hexamethylenetetramine (HMT) at 90 °C. First, the AZO seed layer of 80 nm thickness was deposited on the r-plane sapphire substrate by a radio frequency magnetron sputter. After that, we grew the ZnO nanowires on the seed layer by changing the precursor concentration of the aqueous solution from 0.025 M to 0.01 M. When the molar concentration of the precursor was changed, the diameter, length, density and number of ZnO nanowires also changed significantly: diameter, length and density increased with increasing molar concentration but the number of ZnO nanowires decreased. The ZnO nanowires grown at the higher molar concentration tended to grow along with the c-axis direction, as revealed by atomic force microscope and X-ray diffraction peaks. Furthermore, the PL spectra measured at room-temperature revealed a UV emission of 380 nm which can be attributed to the radiative recombination of free and bound excitons (Near Band edge Emission). The NBE emission was also increased with increasing molar concentration. PMID:25936038

  3. Transport properties and c/a ratio of V{sub 2}O{sub 3} thin films grown on C- and R-plane sapphire substrates by pulsed laser deposition

    SciTech Connect

    Sakai, Joe; Limelette, Patrice

    2015-12-14

    We prepared V{sub 2}O{sub 3} thin films on C- or R-plane sapphire (Al{sub 2}O{sub 3}) substrates by a pulsed laser deposition method. X-ray diffraction analyses confirmed that single-phase V{sub 2}O{sub 3} films were epitaxially grown on both C- and R-planes under an Ar gas ambient of 2 × 10{sup −2} mbar at a substrate temperature of 873 K. Depending on the deposition conditions, c/a ratios at room temperature of (0001)-oriented V{sub 2}O{sub 3} films widely ranged from 2.79 to 2.88. Among them, the films of 2.81 ≤ c/a ≤ 2.84 showed complex metal (M)–insulator (I)–M transition during cooling from 300 to 10 K, while those of larger c/a ratios were accompanied by metallic properties throughout this temperature range. All the films on R-plane substrates underwent simple M-I transition at ∼150 K, which was more abrupt than the films on C-plane, whereas their c/a ratios were narrowly distributed. The distinct difference of M-I transition properties between C- and R-plane films is explained by the intrinsic a- and c-axes evolution through the transition from M to I phases.

  4. Effects of AlN buffer layer thickness on the crystallinity and surface morphology of 10-µm-thick a-plane AlN films grown on r-plane sapphire substrates

    NASA Astrophysics Data System (ADS)

    Lin, Chia-Hung; Tamaki, Shinya; Yamashita, Yasuhiro; Miyake, Hideto; Hiramatsu, Kazumasa

    2016-08-01

    10-µm-thick a-plane AlN(11\\bar{2}0) films containing a low-temperature AlN (LT-AlN) buffer layer and a high-temperature AlN (HT-AlN) film were prepared on r-plane sapphire (1\\bar{1}02) substrates. The crystallinity of all the samples with different LT-AlN buffer layer thicknesses was improved after thermal annealing and HT-AlN growth, mainly owing to the elimination of domain boundaries and the concurrent suppression of facet formation. The optimum crystallinity of HT-AlN films was obtained with full widths at half maximum of the X-ray rocking curves of 660 arcsec for AlN(11\\bar{2}0)\\parallel [1\\bar{1}00]AlN and 840 arcsec for (0002) using a 200-nm-thick LT-AlN buffer layer.

  5. Step-induced misorientation of GaN grown on r-plane sapphire

    SciTech Connect

    Smalc-Koziorowska, J.; Dimitrakopulos, G. P.; Sahonta, S.-L.; Komninou, Ph.; Tsiakatouras, G.; Georgakilas, A.

    2008-07-14

    In the growth of nonpolar (1120) a-plane GaN on r-plane (1102) sapphire by plasma-assisted molecular beam epitaxy, misoriented crystallites are observed close to the substrate. They have average diameter {approx}10 nm and are oriented with the (0001){sub GaN} plane approximately parallel to the (2113){sub sapph.} plane and [0110]{sub GaN} parallel [1101]{sub sapph.}. This semipolar orientation is promoted by a low misfit (2.4%) between (1011){sub GaN} and (1210){sub sapph.} planes. Its introduction, after nitridation treatment, is due to GaN nucleation on (2113){sub sapph.} step facets inclined at 26 deg. relative to the r-plane. Two variants are observed, leading to twinning when they abut inside the epilayer.

  6. High Temperature Characteristics of Coplanar Waveguide on R-Plane Sapphire and Alumina

    NASA Technical Reports Server (NTRS)

    Ponchak, George E.; Jordan, Jennifer L.; Scardelletti, Maximilian C.

    2007-01-01

    This paper presents the characteristics of coplanar waveguide transmission lines on R-plane sapphire and alumina over the temperature range of 25 to 400 C and the frequency range of 45 MHz to 50 GHz. A Thru-Reflect-Line calibration technique and open circuited terminated stubs are used to extract the attenuation and effective permittivity. It is shown that the effective permittivity of the transmission lines and, therefore, the relative dielectric constant of the two substrates increase linearly with temperature. The attenuation of the coplanar waveguide varies linearly with temperature through 200 C, and increases at a greater rate above 200 C.

  7. Direct spontaneous growth and interfacial structural properties of inclined GaN nanopillars on r-plane sapphire

    SciTech Connect

    Adikimenakis, A.; Aretouli, K. E.; Tsagaraki, K.; Androulidaki, M.; Georgakilas, A.; Lotsari, A.; Dimitrakopulos, G. P. Kehagias, Th.; Komninou, Ph.

    2015-06-28

    The spontaneous growth of GaN nanopillars (NPs) by direct plasma-assisted molecular beam epitaxy on nitridated r-plane sapphire substrates has been studied. The emanation of metal-polarity NPs from inside an a-plane nonpolar GaN film was found to depend on both the substrate nitridation and the growth conditions. The density of NPs increased with increasing the duration of the nitridation process and the power applied on the radio-frequency plasma source, as well as the III/V flux ratio, while variation of the first two parameters enhanced the roughness of the substrate's surface. Transmission electron microscopy (TEM) techniques were employed to reveal the structural characteristics of the NPs and their nucleation mechanism from steps on the sapphire surface and/or interfacial semipolar GaN nanocrystals. Lattice strain measurements showed a possible Al enrichment of the first 5–6 monolayers of the NPs. By combining cross-sectional and plan-view TEM observations, the three-dimensional model of the NPs was constructed. The orientation relationship and interfacial accommodation between the NPs and the nonpolar a-plane GaN film were also elucidated. The NPs exhibited strong and narrow excitonic emission, suggesting an excellent structural quality.

  8. Epitaxial growth, electrical and optical properties of a-plane InN on r-plane sapphire

    SciTech Connect

    Ajagunna, A. O.; Iliopoulos, E.; Tsiakatouras, G.; Tsagaraki, K.; Androulidaki, M.; Georgakilas, A.

    2010-01-15

    The heteroepitaxy of a-plane (1120) InN films on r-plane (1102) sapphire substrates, by nitrogen radio frequency plasma-assisted molecular beam epitaxy, has been investigated and compared to that of c-plane (0001) InN. The epitaxial growth of a-plane InN proceeded through the nucleation, growth, and coalescence of three-dimensional islands, resulting in surface roughness that increased monotonically with epilayer thickness. The full width at half maximum of (1120) x-ray diffraction rocking curves decreased significantly with increasing InN thickness, characteristic of structural improvement, and it reached the value of 24 arcmin for a 1 {mu}m thick film. Hall-effect measurements exhibited a similar dependence of electron concentration and mobility on thickness for both the a- and c-plane InN films. The analysis of the Hall-effect measurements, by considering the contribution of two conducting layers, indicates a similar accumulation of low mobility electrons with N{sub s}>10{sup 14} cm{sup -2} at the films' surface/interfacial region for both the a- and c-plane InN films. From optical transmittance measurements, the absorption edge of 0.768 eV was determined for the 1 {mu}m a-plane film, consistent with the expected Burstein-Moss effect. Photoluminescence spectra exhibited a lower energy peak at 0.631 eV, suggesting defect-related transitions.

  9. Interfacial structure and defect analysis of nonpolar ZnO films grown on R-plane sapphire by molecular beam epitaxy

    SciTech Connect

    Vennegues, P.; Korytov, M.; Deparis, C.; Zuniga-Perez, J.; Morhain, C.; Chauveau, J. M.

    2008-04-15

    The interfacial relationship and the microstructure of nonpolar (11-20) ZnO films epitaxially grown on (1-102) R-plane sapphire by molecular beam epitaxy are investigated by transmission electron microscopy. The already-reported epitaxial relationships [1-100]{sub ZnO} parallel [11-20]{sub sapphire} and <0001>{sub ZnO} parallel [-1101]{sub sapphire} are confirmed, and we have determined the orientation of the Zn-O (cation-anion) bond along [0001]{sub ZnO} in the films as being uniquely defined with respect to a reference surface Al-O bond on the sapphire substrate. The microstructure of the films is dominated by the presence of I{sub 1} basal stacking faults [density=(1-2)x10{sup 5} cm{sup -1}] and related partial dislocations [density=(4-7)x10{sup 10} cm{sup -2}]. It is shown that I{sub 1} basal stacking faults correspond to dissociated perfect dislocations, either c or a+c type.

  10. Highly ordered catalyst-free and mask-free GaN nanorods on r-plane sapphire.

    PubMed

    Aschenbrenner, T; Kruse, C; Kunert, G; Figge, S; Sebald, K; Kalden, J; Voss, T; Gutowski, J; Hommel, D

    2009-02-18

    Self-organized and highly ordered GaN nanorods were grown without catalyst on r-plane sapphire using a combination of molecular beam epitaxy and metal-organic vapor-phase epitaxy. AlN nucleation centers for the nanorods were prepared by nitridation of the sapphire in a metal-organic vapor-phase epitaxy reactor, while the nanorods were grown by molecular beam epitaxy. A coalesced two-dimensional GaN layer was observed between the nanorods. The nanorods are inclined by 62 degrees towards the [Formula: see text]-directions of the a-plane GaN layer. The high degree of ordering and the structural perfection were confirmed by micro-photoluminescence measurements. PMID:19417425

  11. Highly ordered catalyst-free and mask-free GaN nanorods on r-plane sapphire.

    PubMed

    Aschenbrenner, T; Kruse, C; Kunert, G; Figge, S; Sebald, K; Kalden, J; Voss, T; Gutowski, J; Hommel, D

    2009-02-18

    Self-organized and highly ordered GaN nanorods were grown without catalyst on r-plane sapphire using a combination of molecular beam epitaxy and metal-organic vapor-phase epitaxy. AlN nucleation centers for the nanorods were prepared by nitridation of the sapphire in a metal-organic vapor-phase epitaxy reactor, while the nanorods were grown by molecular beam epitaxy. A coalesced two-dimensional GaN layer was observed between the nanorods. The nanorods are inclined by 62 degrees towards the [Formula: see text]-directions of the a-plane GaN layer. The high degree of ordering and the structural perfection were confirmed by micro-photoluminescence measurements.

  12. Growth of low-defect-density nonpolar a-plane GaN on r-plane sapphire using pulse NH3 interrupted etching.

    PubMed

    Son, Ji-Su; Honda, Yoshio; Amano, Hiroshi

    2014-02-10

    Nonpolar a-plane (11-20) GaN (a-GaN) layers with low overall defect density and high crystalline quality were grown on r-plane sapphire substrates using etched a-GaN. The a-GaN layer was etched by pulse NH3 interrupted etching. Subsequently, a 2-µm-thick Si-doped a-GaN layer was regrown on the etched a-GaN layer. A fully coalescent n-type a-GaN layer with a low threading dislocation density (~7.5 × 10(8) cm(-2)) and a low basal stacking fault density (~1.8 × 10(5) cm(-1)) was obtained. Compared with a planar sample, the full width at half maximum of the (11-20) X-ray rocking curve was significantly decreased to 518 arcsec along the c-axis direction and 562 arcsec along the m-axis direction.

  13. Epitaxial relationship of semipolar s-plane (1101) InN grown on r-plane sapphire

    SciTech Connect

    Dimitrakopulos, G. P.

    2012-07-02

    The heteroepitaxy of semipolar s-plane (1101) InN grown directly on r-plane sapphire by plasma-assisted molecular beam epitaxy is studied using transmission electron microscopy techniques. The epitaxial relationship is determined to be (1101){sub InN} Parallel-To (1102){sub Al{sub 2O{sub 3}}}, [1120]{sub InN} Parallel-To [2021]{sub Al{sub 2O{sub 3}}}, [1102]{sub InN}{approx} Parallel-To [0221]{sub Al{sub 2O{sub 3}}}, which ensures a 0.7% misfit along [1120]{sub InN}. Two orientation variants are identified. Proposed geometrical factors contributing to the high density of basal stacking faults, partial dislocations, and sphalerite cubic pockets include the misfit accommodation and reduction, as well as the accommodation of lattice twist.

  14. Structural anisotropic properties of a-plane GaN epilayers grown on r-plane sapphire by molecular beam epitaxy

    SciTech Connect

    Lotsari, A.; Kehagias, Th.; Katsikini, M.; Arvanitidis, J.; Ves, S.; Komninou, Ph.; Dimitrakopulos, G. P.; Tsiakatouras, G.; Tsagaraki, K.; Georgakilas, A.; Christofilos, D.

    2014-06-07

    Heteroepitaxial non-polar III-Nitride layers may exhibit extensive anisotropy in the surface morphology and the epilayer microstructure along distinct in-plane directions. The structural anisotropy, evidenced by the “M”-shape dependence of the (112{sup ¯}0) x-ray rocking curve widths on the beam azimuth angle, was studied by combining transmission electron microscopy observations, Raman spectroscopy, high resolution x-ray diffraction, and atomic force microscopy in a-plane GaN epilayers grown on r-plane sapphire substrates by plasma-assisted molecular beam epitaxy (PAMBE). The structural anisotropic behavior was attributed quantitatively to the high dislocation densities, particularly the Frank-Shockley partial dislocations that delimit the I{sub 1} intrinsic basal stacking faults, and to the concomitant plastic strain relaxation. On the other hand, isotropic samples exhibited lower dislocation densities and a biaxial residual stress state. For PAMBE growth, the anisotropy was correlated to N-rich (or Ga-poor) conditions on the surface during growth, that result in formation of asymmetric a-plane GaN grains elongated along the c-axis. Such conditions enhance the anisotropy of gallium diffusion on the surface and reduce the GaN nucleation rate.

  15. Crystal orientation mechanism of ZnTe epilayers formed on different orientations of sapphire substrates by molecular beam epitaxy

    SciTech Connect

    Nakasu, T. Yamashita, S.; Aiba, T.; Hattori, S.; Sun, W.; Taguri, K.; Kazami, F.; Kobayashi, M.

    2014-10-28

    The electrooptic effect in ZnTe has recently attracted research attention, and various device structures using ZnTe have been explored. For application to practical terahertz wave detector devices based on ZnTe thin films, sapphire substrates are preferred because they enable the optical path alignment to be simplified. ZnTe/sapphire heterostructures were focused upon, and ZnTe epilayers were prepared on highly mismatched sapphire substrates by molecular beam epitaxy. Epitaxial relationships between the ZnTe thin films and the sapphire substrates with their various orientations were investigated using an X-ray diffraction pole figure method. (0001) c-plane, (1-102) r-plane, (1-100) m-plane, and (11-20) a-plane oriented sapphire substrates were used in this study. The epitaxial relationship between ZnTe and c-plane sapphire was found to be (111) ZnTe//(0001) sapphire with an in-plane orientation relationship of [−211] ZnTe//[1-100] sapphire. It was found that the (211)-plane ZnTe layer was grown on the m-plane of the sapphire substrates, and the (100)-plane ZnTe layer was grown on the r-plane sapphire. When the sapphire substrates were inclined from the c-plane towards the m-axis direction, the orientation of the ZnTe thin films was then tilted from the (111)-plane to the (211)-plane. The c-plane of the sapphire substrates governs the formation of the (111) ZnTe domain and the ZnTe epilayer orientation. These crystallographic features were also related to the atom arrangements of ZnTe and sapphire.

  16. High Mobility SiGe/Si n-MODFET Structures and Devices on Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Mueller, Carl; Alterovitz, Samuel; Croke, Edward; Ponchak, George

    2004-01-01

    Si/Ge/Si n-type modulation doped field effect structures and transistors (n-MODFET's) have been fabricated on r-plane sapphire substrates. Mobilities as high as 1380 cm(exp 2)/Vs were measured at room temperature. Excellent carrier confinement was shown by Shubnikov-de Haas measurements. Atomic force microscopy indicated smooth surfaces, with rm's roughness less than 4 nm, similar to the quality of SiGe/Si n-MODFET structures made on Si substrates. Transistors with 2 micron gate lengths and 200 micron gate widths were fabricated and tested.

  17. Crystallographic tilt and in-plane anisotropies of an a-plane InGaN/GaN layered structure grown by MOCVD on r-plane sapphire using a ZnO buffer

    NASA Astrophysics Data System (ADS)

    Liu, H. F.; Liu, W.; Guo, S.; Chi, D. Z.

    2016-03-01

    High-resolution x-ray diffraction (HRXRD) was used to investigate the crystallographic tilts and structural anisotropies in epitaxial nonpolar a-plane InGaN/GaN grown by metal-organic chemical vapor deposition on r-plane sapphire using a ZnO buffer. The substrate had an unintentional miscut of 0.14° towards its [-4 2 2 3] axis. However, HRXRD revealed a tilt of 0.26° (0.20°) between the ZnO (GaN) (11-20) and the Al2O3 (1-102) atomic planes, with the (11-20) axis of ZnO (GaN) tilted towards its c-axis, which has a difference of 163° in azimuth from that of the substrate’s miscut. Excess broadenings in the GaN/ZnO (11-20) rocking curves (RCs) were observed along its c-axis. Specific analyses revealed that partial dislocations and anisotropic in-plane strains, rather than surface-related effects, wafer curvature or stacking faults, are the dominant factors for the structural anisotropy. The orientation of the partial dislocations is most likely affected by the miscut of the substrate, e.g. via tilting of the misfit dislocation gliding planes created during island coalescences. Their Burgers vector components in the growth direction, in turn, gave rise to crystallographic tilts in the same direction as that of the excess RC-broadenings.

  18. Improvements in Optical Properties of Semipolar r-Plane GaN Films Grown Using Atomically Flat ZnO Substrates and Room-Temperature Epitaxial Buffer Layers

    NASA Astrophysics Data System (ADS)

    Kobayashi, Atsushi; Kawano, Satoshi; Ueno, Kohei; Ohta, Jitsuo; Fujioka, Hiroshi

    2010-10-01

    We have investigated the structural and optical properties of semipolar r-plane GaN{1102} films grown on nearly-lattice-matched ZnO substrates with room-temperature (RT) epitaxial GaN buffer layers, putting special emphasis on the effect of surface treatment of the ZnO substrates. The full-width at half-maximum values of X-ray rocking curves for 1-µm-thick r-plane GaN layers grown at 700 °C on these RT-buffer layers, as measured using various X-ray incidence geometries, are in a range from 313 to 598 arcsec. Photoluminescence peaks attributable to structural defects in the r-plane GaN films have been shown to be reduced, and the near-band-edge emission has been enhanced by approximately 5 times by the use of atomically-flat r-plane ZnO substrates prepared by high-temperature annealing in air inside a box made of ZnO.

  19. Effect of sapphire substrate orientations on the microstructural, optical and NO2 gas sensing properties of Zn(1-x)CdxO thin films synthesized by sol gel spin-coating method

    NASA Astrophysics Data System (ADS)

    Boukadhaba, M. A.; Chebil, W.; Fouzri, A.; Sallet, V.; Lusson, A.; Amiri, G.; Vilar, C.; Oumezzine, M.

    2016-06-01

    A simple and cost-effective sol-gel technique was employed to elaborate ZnO and Zn(1-x)CdxO thin films deposit by spin coating onto the c- and r-plane sapphire substrates. The deposited films were characterized for their structural, morphological and optical properties using high resolution X ray diffraction (HRXRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM) as function of Cd incorporation and employed substrate. Higher Cd incorporation (4.5%) is obtained for ZnCdO layer deposited on r-plane sapphire, which is confirmed by the greatest energy shift (110 meV) to lower energy measured by low temperature photoluminescence. X-ray diffraction study revealed that all films are polycrystalline with a hexagonal wurtzite structure. A preferred orientation along [001] and [110] direction is obtained respectively for layer deposited on c- and r-plane sapphire. However, the (002) and (110) XRD layers peak were shifted towards the lower 2θ values after Cd incorporation showing a slight variation of cell parameters. SEM and AFM image show no very significant variation in the morphology of the layers depending on the substrate orientation and Cd content incorporated. A mixture of large and small hexagonal grains are obtained which are more pronounced for ZnCdO deposited on r-plane sapphire and their agglomeration leaves more empty space in films. The gas sensing performances were tested in NO2 containing air for different operating temperatures as function of Cd incorporation and sapphire substrate orientation. The experimental result exhibited that ZnCdO sensors deposited on r-plane sapphire shows a more better gas response with fast response and recovery time at moderate operating temperatures as Cd contend increase.

  20. Epitaxial Relationship Analysis Between ZnTe Epilayers and Sapphire Substrates

    NASA Astrophysics Data System (ADS)

    Nakasu, Taizo; Aiba, Takayuki; Yamashita, Sotaro; Hattori, Shota; Kizu, Takeru; Sun, Wei-Che; Taguri, Kosuke; Kazami, Fukino; Hashimoto, Yuki; Ozaki, Shun; Kobayashi, Masakazu; Asahi, Toshiaki

    2016-10-01

    Zinc telluride (ZnTe) epilayers were grown on S-plane (10bar{1}1) sapphire substrates by molecular beam epitaxy, and the epitaxial relationships between the two were compared with data previously obtained for layers grown on c-plane (0001), m-plane (10bar{1}0 ) substrates, and r-plane (1bar{1}02 ). The crystallographic relationship between the (111) plane of the ZnTe layer and (0001) plane of the substrate was studied using x-ray diffraction pole figure measurements. It was confirmed that two kinds of {111} oriented domains were formed on the S-plane substrate, and the dominant domain was (111)-oriented. Layers grown on S-plane substrate and on m-plane substrate exhibited the same epitaxial relationship, while the epitaxial relationship of the layer grown on the c-plane substrate exhibited a 60° rotation. These findings would be applicable to control the orientation of ZnTe epilayer surface for various device applications and for various physical property characterizations.

  1. Ultrasonic flexural vibration assisted chemical mechanical polishing for sapphire substrate

    NASA Astrophysics Data System (ADS)

    Xu, Wenhu; Lu, Xinchun; Pan, Guoshun; Lei, Yuanzhong; Luo, Jianbin

    2010-04-01

    The sapphire substrates are polished by traditional chemical mechanical polishing (CMP) and ultrasonic flexural vibration (UFV) assisted CMP (UFV-CMP) respectively with different pressures. UFV-CMP combines the functions of traditional CMP and ultrasonic machining (USM) and has special characteristics, which is that ultrasonic vibrations of the rotating polishing head are in both horizontal and vertical directions. The material removal rates (MRRs) and the polished surface morphology of CMP and UFV-CMP are compared. The MRR of UFV-CMP is two times larger than that of traditional CMP. The surface roughness (root mean square, RMS) of the polished sapphire substrate of UFV-CMP is 0.83 Å measured by the atomic force microscopy (AFM), which is much better than 2.12 Å obtained using the traditional CMP. And the surface flatness of UFV-CMP is 0.12 μm, which is also better than 0.23 μm of the traditional CMP. The results show that UFV-CMP is able to improve the MRR and finished surface quality of the sapphire substrates greatly. The material removal and surface polishing mechanisms of sapphire in UFV-CMP are discussed too.

  2. GaN grown on nano-patterned sapphire substrates

    NASA Astrophysics Data System (ADS)

    Jing, Kong; Meixin, Feng; Jin, Cai; Hui, Wang; Huaibing, Wang; Hui, Yang

    2015-04-01

    High-quality gallium nitride (GaN) film was grown on nano-patterned sapphire substrates (NPSS) and investigated using XRD and SEM. It was found that the optimum thickness of the GaN buffer layer on the NPSS is 15 nm, which is thinner than that on micro-patterned sapphire substrates (MPSS). An interesting phenomenon was observed for GaN film grown on NPSS:GaN mainly grows on the trench regions and little grows on the sidewalls of the patterns at the initial growth stage, which is dramatically different from GaN grown on MPSS. In addition, the electrical and optical properties of LEDs grown on NPSS were characterized. Project supported by the Suzhou Nanojoin Photonics Co., Ltd and the High-Tech Achievements Transformation of Jiangsu Province, China (No.BA2012010).

  3. Lattice-Matched Semiconductor Layers on Single Crystalline Sapphire Substrate

    NASA Technical Reports Server (NTRS)

    Choi, Sang; King, Glen; Park, Yeonjoon

    2009-01-01

    SiGe is an important semiconductor alloy for high-speed field effect transistors (FETs), high-temperature thermoelectric devices, photovoltaic solar cells, and photon detectors. The growth of SiGe layer is difficult because SiGe alloys have different lattice constants from those of the common Si wafers, which leads to a high density of defects, including dislocations, micro-twins, cracks, and delaminations. This innovation utilizes newly developed rhombohedral epitaxy of cubic semiconductors on trigonal substrates in order to solve the lattice mismatch problem of SiGe by using trigonal single crystals like sapphire (Al2O3) as substrate to give a unique growth-orientation to the SiGe layer, which is automatically controlled at the interface upon sapphire (0001). This technology is different from previous silicon on insulator (SOI) or SGOI (SiGe on insulator) technologies that use amorphous SiO2 as the growth plane. A cubic semiconductor crystal is a special case of a rhombohedron with the inter-planar angle, alpha = 90 deg. With a mathematical transformation, all rhombohedrons can be described by trigonal crystal lattice structures. Therefore, all cubic lattice constants and crystal planes (hkl) s can be transformed into those of trigonal crystal parameters. These unique alignments enable a new opportunity of perfect lattice matching conditions, which can eliminate misfit dislocations. Previously, these atomic alignments were thought to be impossible or very difficult. With the invention of a new x-ray diffraction measurement method here, growth of cubic semiconductors on trigonal crystals became possible. This epitaxy and lattice-matching condition can be applied not only to SiGe (111)/sapphire (0001) substrate relations, but also to other crystal structures and other materials, including similar crystal structures which have pointgroup rotational symmetries by 120 because the cubic (111) direction has 120 rotational symmetry. The use of slightly miscut (less than

  4. Epitaxial aluminum-doped zinc oxide thin films on sapphire. 1: Effect of substrate orientation

    SciTech Connect

    Srikant, V.; Sergo, V.; Clarke, D.R.

    1995-07-01

    Epitaxial thin films of Al-doped zinc oxide have been grown on sapphire substrates by pulsed laser ablation. The effect of substrate temperature, background pressure of oxygen, and substrate orientation (A, M, R, C) on the orientation relationships between ZnO and sapphire have been evaluated using on- and off-axis X-ray diffractometry. Under all growth conditions zinc oxide, on A- and C-plane sapphire, grew with the c-axis perpendicular to the substrate. In contrast, on M and R orientations of sapphire, ZnO grew with its c-axis parallel or perpendicular to the substrate depending on the substrate temperature and background pressure employed during growth. In all cases only one unique in-plane relationship between the sapphire substrate and the zinc oxide film was found with the exception of the M-plane at high substrate temperatures.

  5. High Electron Mobility SiGe/Si Transistor Structures on Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Alterovitz, Samuel A.; Mueller, Carl H.; Croke, Edward T.; Ponchak, George E.

    2004-01-01

    SiGe/Si n-type modulation doped field effect structures and transistors (n-MODFETs) have been fabricated on r-plane sapphire substrates. The structures were deposited using molecular beam epitaxy, and antimony dopants were incorporated via a delta doping process. Secondary ion mass spectroscopy (SIMS) indicates that the peak antimony concentration was approximately 4 x 10(exp 19) per cubic centimeter. At these two temperatures, the electron carrier densities were 1.6 and 1.33 x 10(exp 12) per square centimeter, thus demonstrating that carrier confinement was excellent. Shubnikov-de Haas oscillations were observed at 0.25 K, thus confirming the two-dimensional nature of the carriers. Transistors, with gate lengths varying from 1 micron to 5 microns, were fabricated using these structures and dc characterization was performed at room temperature. The saturated drain current region extended over a wide source-to-drain voltage (V (sub DS)) range, with V (sub DS) knee voltages of approximately 0.5 V and increased leakage starting at voltages slightly higher than 4 V.

  6. High Electron Mobility SiGe/Si Transistor Structures on Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Alterovitz, Samuel A.; Mueller, Carl H.; Croke, Edward T.; Ponchak, George E.

    2003-01-01

    SiGe/Si n-type modulation doped field effect structures and transistors (n-MODFETs) have been fabricated on r-plane sapphire substrates. The structures were deposited using molecular beam epitaxy, and antimony dopants were incorporated via a delta doping process. Secondary ion mass spectroscopy (SIMS) indicates that the peak antimony, concentration was approximately 4 x 10(exp19) per cubic cm. The electron mobility was over 1,200 and 13,000 sq cm/V-sec at room temperature and 0.25 K, respectively. At these two temperatures, the electron carrier densities were 1.6 and 1.33 x 10(exp 12) per sq cm, thus demonstrating that carrier confinement was excellent. Shubnikov-de Haas oscillations were observed at 0.25 K, thus confirming the two-dimensional nature of the carriers. Transistors, with gate lengths varying from 1 micron to 5 microns, were fabricated using these structures and dc characterization was performed at room temperature. The saturated drain current region extended over a wide source-to-drain voltage (V(sub DS)) range, with (V(sub DS)) knee voltages of approximately 0.5 V and increased leakage starting at voltages slightly higher than 4 V.

  7. Properties of GaN grown on sapphire substrates

    NASA Technical Reports Server (NTRS)

    Crouch, R. K.; Debnam, W. J.; Fripp, A. L.

    1978-01-01

    Epitaxial growth of GaN on sapphire substrates using an open-tube growth furnace has been carried out to study the effects of substrate orientation and transfer gas upon the properties of the layers. It has been found that for the (0001) substrates, surface appearance was virtually independent of carrier gas and of doping levels. For the (1(-1)02) substrates surface faceting was greatly reduced when He was used as a transfer gas as opposed to H2. Faceting was also reduced when the GaN was doped with Zn, and the best surfaces for the (1(-1)02) substrates were obtained in a Zn-doped run using He as the transfer gas. The best sample in terms of electrical properties for the (1(-1)02) substrate had a mobility greater than 400 sq cm/V per sec and a carrier concentration of about 10 to the 17th per cu cm. This sample was undoped and used He as the transfer gas. The best (0001) sample was also grown undoped with He as the transfer gas and had a mobility of 300 sq cm/V per sec and a carrier concentration of 1 x 10 to the 18th per cu cm.

  8. High Electron Mobility Transistor Structures on Sapphire Substrates Using CMOS Compatible Processing Techniques

    NASA Technical Reports Server (NTRS)

    Mueller, Carl; Alterovitz, Samuel; Croke, Edward; Ponchak, George

    2004-01-01

    System-on-a-chip (SOC) processes are under intense development for high-speed, high frequency transceiver circuitry. As frequencies, data rates, and circuit complexity increases, the need for substrates that enable high-speed analog operation, low-power digital circuitry, and excellent isolation between devices becomes increasingly critical. SiGe/Si modulation doped field effect transistors (MODFETs) with high carrier mobilities are currently under development to meet the active RF device needs. However, as the substrate normally used is Si, the low-to-modest substrate resistivity causes large losses in the passive elements required for a complete high frequency circuit. These losses are projected to become increasingly troublesome as device frequencies progress to the Ku-band (12 - 18 GHz) and beyond. Sapphire is an excellent substrate for high frequency SOC designs because it supports excellent both active and passive RF device performance, as well as low-power digital operations. We are developing high electron mobility SiGe/Si transistor structures on r-plane sapphire, using either in-situ grown n-MODFET structures or ion-implanted high electron mobility transistor (HEMT) structures. Advantages of the MODFET structures include high electron mobilities at all temperatures (relative to ion-implanted HEMT structures), with mobility continuously improving to cryogenic temperatures. We have measured electron mobilities over 1,200 and 13,000 sq cm/V-sec at room temperature and 0.25 K, respectively in MODFET structures. The electron carrier densities were 1.6 and 1.33 x 10(exp 12)/sq cm at room and liquid helium temperature, respectively, denoting excellent carrier confinement. Using this technique, we have observed electron mobilities as high as 900 sq cm/V-sec at room temperature at a carrier density of 1.3 x 10(exp 12)/sq cm. The temperature dependence of mobility for both the MODFET and HEMT structures provides insights into the mechanisms that allow for enhanced

  9. Layer matching epitaxy of NiO thin films on atomically stepped sapphire (0001) substrates

    PubMed Central

    Yamauchi, Ryosuke; Hamasaki, Yosuke; Shibuya, Takuto; Saito, Akira; Tsuchimine, Nobuo; Koyama, Koji; Matsuda, Akifumi; Yoshimoto, Mamoru

    2015-01-01

    Thin-film epitaxy is critical for investigating the original properties of materials. To obtain epitaxial films, careful consideration of the external conditions, i.e. single-crystal substrate, temperature, deposition pressure and fabrication method, is significantly important. In particular, selection of the single-crystal substrate is the first step towards fabrication of a high-quality film. Sapphire (single-crystalline α-Al2O3) is commonly used in industry as a thin-film crystal-growth substrate, and functional thin-film materials deposited on sapphire substrates have found industrial applications. However, while sapphire is a single crystal, two types of atomic planes exist in accordance with step height. Here we discuss the need to consider the lattice mismatch for each of the sapphire atomic layers. Furthermore, through cross-sectional transmission electron microscopy analysis, we demonstrate the uniepitaxial growth of cubic crystalline thin films on bistepped sapphire (0001) substrates. PMID:26402241

  10. Development of patterned sapphire substrate and the application to the growth of non-polar and semi-polar GaN for light-emitting diodes

    NASA Astrophysics Data System (ADS)

    Tadatomo, Kazuyuki; Okada, Narihito

    2011-03-01

    The light-emitting diodes (LEDs) with high external quantum efficiency (EQE) are usually fabricated on the patterned sapphire substrate (PSS). The PSS reduces the dislocation density in the GaN layer and enhances the light extraction efficiency (LEE) from the LED chip by scattering the light confined in GaN layer attributed to the critical angle between GaN (n=2.4) and sapphire substrate (n=1.7) (or air (n=1.0)). On the other hand, non-polar GaN and semipolar GaN are attracted much attention to eliminate the quantum confined Stark effect (QCSE). Recently, we have developed novel technology to grow non-polar or semi-polar GaN on the PSS with high quality and large diameter by metal-organic vapor phase epitaxy (MOVPE). For example, m-plane GaN grown on a-plane PSS and {112 (see manuscript)} plane GaN grown on r-plane PSS. The growth of c-plane GaN from the c-plane-like sidewall of the r-plane PSS results in {112 (see manuscript)} GaN on the r-plane PSS. The full widths at half maximum of X-ray rocking curves (FWHM-XRC) of the {112(see manuscript)} GaN along the azimuths parallel and perpendicular to the c-direction were 533 and 260 arcsec, respectively. Dislocation density of the GaN was approximately 2×108 cm-2. These non-polar and semi-polar GaN are expected to be suitable for novel GaN substrate or GaN template for LEDs.

  11. Microwave properties of peeled HEMT devices sapphire substrates

    NASA Technical Reports Server (NTRS)

    Young, Paul G.; Alterovitz, Samuel A.; Mena, Rafael A.; Smith, Edwyn D.

    1992-01-01

    The focus of this research is to demonstrate the first full radio frequency characterization of high electron mobility transistor (HEMT) device parameters. The results of this research are used in the design of circuits with peeled HEMT devices, e.g. 10 GHz amplifiers. Devices were fabricated using two HEMT structures grown by molecular beam epitaxy methods. A 500 A AlAs release layer for 'peel off' was included under the active layers of the structure. The structures are a homogeneously doped Al(0.3)GA(0.7)As/GaAs and a delta doped square well Al(.23)Ga(.77)As/GaAs HEMT structure. Devices were fabricated using a mesa isolation process. Contacts were done by sequentially evaporating Au/Ge/Au/Ni/Au followed by rapid thermal anneal at 400 C for 15 seconds. Gates were wet etch recessed and 1 to 1.4 micron Ti/Au gate metal was deposited. Devices were peeled off the GaAs substrate using Apiezon wax to support the active layer and a HF:DI (1:10) solution to remove the AlAs separation layer. Devices were then attached to sapphire substrates using van der Waals bonding.

  12. Behavior of a Josephson Flux Qubit on a Sapphire Substrate

    NASA Astrophysics Data System (ADS)

    Przybysz, Anthony; Crowe, E.; Kwon, H.; Cooper, B. K.; Lewis, R. M.; Palmer, B. S.; Anderson, J. R.; Lobb, C. J.; Wellstood, F. C.

    2009-03-01

    We discuss the design, fabrication, and testing of a Nakamura- style [1] flux qubit. The device consists of a four-Josephson junction qubit loop that is directly coupled to a small dc SQUID, which is used for detection. The device was built on a sapphire substrate using electron beam lithography and double angle evaporation to form the Al/AlOx/Al tunnel junctions. A 200 nm thick layer of aluminum was deposited on the e-beam resist in order to counteract charging effects during the lithography. Three of the junctions in the qubit loop were 100 nm x 250 nm, and the fourth was 100 nm x 150 nm. The large junctions are the main contribution to the inductance of the qubit loop, and the smaller junction creates an energy splitting of 1-10 GHz between the two circulating current states. The SQUID junctions were 100 nm x 2000 nm, and the critical current of the detection SQUID was 240 nA. We present the results of ongoing measurements on the behavior of the device at 25 mK. This project was funded by the JQI, LPS, and CNAM. [1] F. Yoshihara, Y. Nakamura, et al.,``Decoherence of Flux Qubit Due to 1/f Flux Noise,'' PRL 97, 167001 (2006).

  13. Control of initial bow of sapphire substrates for III-nitride epitaxy by internally focused laser processing

    NASA Astrophysics Data System (ADS)

    Aida, Hideo; Aota, Natsuko; Takeda, Hidetoshi; Koyama, Koji

    2012-12-01

    Processing by a laser beam focused within the substrate is used to control the initial bowing of sapphire substrates for III-nitride epitaxy. The process modifies the sapphire crystallinity at and near the focal area from single crystal to an amorphous phase. As volume expansion occurs inside the sapphire, strain is generated and, consequently, changes in the bowing. By controlling the focal depth and process pitch, we demonstrate a ˜250 μm pre-bowed sapphire substrate while only ±15 μm of bowing control is possible with a regular wafering process. We also demonstrate epitaxial growth of III-nitride on the pre-bowed sapphire substrates by metal organic chemical vapor deposition (MOCVD), which suggests an enlargement for the process window for III-nitride epitaxy on sapphire substrate. It is also shown that the pre-bowing by laser treatment functions to improve the crystal quality of grown III-nitride films.

  14. Radio-Frequency Performance of Epitaxial Graphene Field-Effect Transistors on Sapphire Substrates

    NASA Astrophysics Data System (ADS)

    Liu, Qing-Bin; Yu, Cui; Li, Jia; Song, Xu-Bo; He, Ze-Zhao; Lu, Wei-Li; Gu, Guo-Dong; Wang, Yuan-Gang; Feng, Zhi-Hong

    2014-07-01

    We report dc and the first-ever measured small signal rf performance of epitaxial graphene field-effect transistors (GFETs), where the epitaxial graphene is grown by chemical vapor deposition (CVD) on a 2-inch c-plane sapphire substrate. Our epitaxial graphene material has a good flatness and uniformity due to the low carbon concentration during the graphene growth. With a gate length Lg = 100 nm, the maximum drain source current Ids and peak transconductance gm reach 0.92 A/mm and 0.143 S/mm, respectively, which are the highest results reported for GFETs directly grown on sapphire. The extrinsic cutoff frequency (fT) and maximum oscillation frequency (fmax) of the device are 12 GHz and 9.5 GHz, and up to 32 GHz and 21.5 GHz after de-embedding, respectively. Our work proves that epitaxial graphene on sapphire substrates is a promising candidate for rf electronics.

  15. Direct Growth Properties of Graphene Layers on Sapphire Substrate by Alcohol-Chemical Vapor Deposition

    NASA Astrophysics Data System (ADS)

    Nakamura, Atsushi; Miyasaka, Yuta; Temmyo, Jiro

    2012-04-01

    Few nanometers thick graphene layers were directly grown on a-plane (11bar 20) sapphire substrates by alcohol-chemical vapor deposition (alcohol-CVD) using ethanol as a carbon source and without any catalytic metal on the substrate surface. The growth relationship between the graphene layer and substrate was analyzed using a transmission electron microscope (TEM). The growth rate of graphene layers with different growth temperatures revealed that the Al atom act as a catalyst for synthesizing a graphitic material during the decomposition of ethanol. An optical transmittance and a sheet resistance of the graphene sheet directly grown on sapphire substrate were observed. SiO2/Si and n-6H-SiC substrates were also examined for graphene direct growth to discuss the catalytic behavior of Si atoms compared with Al atoms.

  16. Experimental study of laser dicing sapphire substrate by green DPSS laser

    NASA Astrophysics Data System (ADS)

    Xie, Xiao-zhu; Huang, Fu-min; Wei, Xin; Hu, Wei; Ren, Qing-lei

    2010-11-01

    Sapphire is an important material for fabricating photonic devices such as light emitting diode (LED). The matter is strongly resistant to wet and dry chemical etching because of its unique physical property. Moreover, there also exist some problems like chipping and edge crack by diamond dicing. Thereby, lots of emerging laser-based techniques have been invented, including various lasers at different wavelength and different technologies, which have gradually become the alternative powerful and efficient methods to dicing this material. Most of investigations on laser dicing sapphire are conducted by UV and ultra-short pulse laser, few by green laser with wavelength of 532nm. So a green laser with wavelength of 532nm and high repetition frequency is employed to dice sapphire substrate. The effects of machining parameters as laser power, repetition frequency, scanning velocity and number of scans on kerf width, kerf depth and aspect ratio are analyzed. Kerf width and depth are measured by optical microscope (OM) and micro-morphology of sapphire is observed by scanning electron microscopy (SEM). Results indicate that narrower kerf, higher aspect ratio and better surface quality can be obtained under the combined processing parameters of medium laser power, lower repetition frequency, medium scanning velocity and multiple scans, which proves green laser to be an effective tool to dice sapphire substrate.

  17. Fabrication of a new substrate for atomic force microscopic observation of DNA molecules from an ultrasmooth sapphire plate.

    PubMed Central

    Yoshida, K; Yoshimoto, M; Sasaki, K; Ohnishi, T; Ushiki, T; Hitomi, J; Yamamoto, S; Sigeno, M

    1998-01-01

    A new stable substrate applicable to the observation of DNA molecules by atomic force microscopy (AFM) was fabricated from a ultrasmooth sapphire (alpha-Al2O3 single crystal) plate. The atomically ultrasmooth sapphire as obtained by high-temperature annealing has hydrophobic surfaces and could not be used for the AFM observation of DNA. However, sapphire treated with Na3PO4 aqueous solution exhibited a hydrophilic character while maintaining a smooth surface structure. The surface of the wet-treated sapphire was found by x-ray photoelectron spectroscopy and AFM to be approximately 0.3 nm. The hydrophilic surface character of the ultrasmooth sapphire plate made it easy for DNA molecules to adhere to the plate. Circular molecules of the plasmid DNA could be imaged by AFM on the hydrophilic ultrasmooth sapphire plate. PMID:9545030

  18. Large-area YBa2Cu3O(7-delta) thin films on sapphire for microwave applications

    NASA Technical Reports Server (NTRS)

    Cole, B. F.; Liang, G.-C.; Newman, N.; Char, K.; Zaharchuk, G.; Martens, J. S.

    1992-01-01

    We have deposited YBa2Cu3O(7-delta) (YBCO) films with low microwave surface resistance (Rs) on 5-cm-diam, oxide-buffered sapphire substrates by planar magnetron sputtering. MgO buffer layers are used on M-plane (1 0 -1 0) sapphire, and R-plane (1 -1 0 2) sapphire is buffered by CeO2. Rs values of 450-620 microhms at 77 K and 10 GHz were measured across an entire 5-cm diam YBCO film on M-plane sapphire. For YBCO on R-plane sapphire, Rs values at 77 K and 10 GHz were 950 microohms for a 5-cm-diam wafer and 700 microohms for 1 x 1 sq cm samples.

  19. Pulsed Laser Deposition of VO2 Single Crystal Thin Films on Sapphire Substrates

    NASA Astrophysics Data System (ADS)

    Zhu, Pei-ran; S, Yamamoto; A, Miyashita; H, Naramoto

    1998-12-01

    Thin films of VO2 single-crystalline on (0001) sapphire substrates have been prepared by visible pulsed laser ablation technique. The crystal quality and properties of the films are evaluated through electrical resistance measurement, x-ray diffraction (XRD), and Rutherford-backscattering spectroscopy/channeling (RBS/C) analysis. The dependence of the surface electrical resistance of the films on the temperature shows semiconductor-to-metal transitions with the resistance change of 7 × 103-2 × 104. The hysteresis widths are from less than 1 to 3 K. XRD and RBS/C data reveal that the films prepared in particular conditions are single-crystalline VO2 with the (010) planes parallel to the surface of the sapphire substrate.

  20. Fabrication of wafer-scale nanopatterned sapphire substrate through phase separation lithography

    NASA Astrophysics Data System (ADS)

    Guo, Xu; Ni, Mengyang; Zhuang, Zhe; Dai, Jiangping; Wu, Feixiang; Cui, Yushuang; Yuan, Changsheng; Ge, Haixiong; Chen, Yanfeng

    2016-04-01

    A phase separation lithography (PSL) based on polymer blend provides an extremely simple, low-cost, and high-throughput way to fabricate wafer-scale disordered nanopatterns. This method was introduced to fabricate nanopatterned sapphire substrates (NPSSs) for GaN-based light-emitting diodes (LEDs). The PSL process only involved in spin-coating of polystyrene (PS)/polyethylene glycol (PEG) polymer blend on sapphire substrate and followed by a development with deionized water to remove PEG moiety. The PS nanoporous network was facilely obtained, and the structural parameters could be effectively tuned by controlling the PS/PEG weight ratio of the spin-coating solution. 2-in. wafer-scale NPSSs were conveniently achieved through the PS nanoporous network in combination with traditional nanofabrication methods, such as O2 reactive ion etching (RIE), e-beam evaporation deposition, liftoff, and chlorine-based RIE. In order to investigate the performance of such NPSSs, typical blue LEDs with emission wavelengths of ~450 nm were grown on the NPSS and a flat sapphire substrate (FSS) by metal-organic chemical vapor deposition, respectively. The integral photoluminescence (PL) intensity of the NPSS LED was enhanced by 32.3 % compared to that of the FSS-LED. The low relative standard deviation of 4.7 % for PL mappings of NPSS LED indicated the high uniformity of PL data across the whole 2-in. wafer. Extremely simple, low cost, and high throughput of the process and the ability to fabricate at the wafer scale make PSL a potential method for production of nanopatterned sapphire substrates.

  1. On the generation of charge-carrier recombination centers in the sapphire substrates of silicon-on-sapphire structures

    SciTech Connect

    Aleksandrov, P. A. Belova, N. E.; Demakov, K. D.; Shemardov, S. G.

    2015-08-15

    A method for the production of high-quality radiation-resistant silicon-on-sapphire structures through the fabrication of a layer of nanopores in sapphire by helium ion implantation, i.e., by creating charge-carrier recombination centers, is proposed. In this case, the quality of the silicon layer is simultaneously improved. The problem of the thermal stability of the pores is discussed with the aim of analyzing the possibility of producing a microcircuit on the resultant modified silicon-on-sapphire sample. The layer of pores possesses a large total surface area and, hence, decreases the lifetime of charge carriers generated during irradiation of the operating microcircuit. This effect reduces the charge at the silicon-sapphire interface and improves radiation resistance.

  2. Synthesis and Transfer of Large-Area Monolayer WS2 Crystals: Moving Toward the Recyclable Use of Sapphire Substrates.

    PubMed

    Xu, Zai-Quan; Zhang, Yupeng; Lin, Shenghuang; Zheng, Changxi; Zhong, Yu Lin; Xia, Xue; Li, Zhipeng; Sophia, Ponraj Joice; Fuhrer, Michael S; Cheng, Yi-Bing; Bao, Qiaoliang

    2015-06-23

    Two-dimensional layered transition metal dichalcogenides (TMDs) show intriguing potential for optoelectronic devices due to their exotic electronic and optical properties. Only a few efforts have been dedicated to large-area growth of TMDs. Practical applications will require improving the efficiency and reducing the cost of production, through (1) new growth methods to produce large size TMD monolayer with less-stringent conditions, and (2) nondestructive transfer techniques that enable multiple reuse of growth substrate. In this work, we report to employ atmospheric pressure chemical vapor deposition (APCVD) for the synthesis of large size (>100 μm) single crystals of atomically thin tungsten disulfide (WS2), a member of TMD family, on sapphire substrate. More importantly, we demonstrate a polystyrene (PS) mediated delamination process via capillary force in water which reduces the etching time in base solution and imposes only minor damage to the sapphire substrate. The transferred WS2 flakes are of excellent continuity and exhibit comparable electron mobility after several growth cycles on the reused sapphire substrate. Interestingly, the photoluminescence emission from WS2 grown on the recycled sapphire is much higher than that on fresh sapphire, possibly due to p-type doping of monolayer WS2 flakes by a thin layer of water intercalated at the atomic steps of the recycled sapphire substrate. The growth and transfer techniques described here are expected to be applicable to other atomically thin TMD materials.

  3. Synthesis and Transfer of Large-Area Monolayer WS2 Crystals: Moving Toward the Recyclable Use of Sapphire Substrates.

    PubMed

    Xu, Zai-Quan; Zhang, Yupeng; Lin, Shenghuang; Zheng, Changxi; Zhong, Yu Lin; Xia, Xue; Li, Zhipeng; Sophia, Ponraj Joice; Fuhrer, Michael S; Cheng, Yi-Bing; Bao, Qiaoliang

    2015-06-23

    Two-dimensional layered transition metal dichalcogenides (TMDs) show intriguing potential for optoelectronic devices due to their exotic electronic and optical properties. Only a few efforts have been dedicated to large-area growth of TMDs. Practical applications will require improving the efficiency and reducing the cost of production, through (1) new growth methods to produce large size TMD monolayer with less-stringent conditions, and (2) nondestructive transfer techniques that enable multiple reuse of growth substrate. In this work, we report to employ atmospheric pressure chemical vapor deposition (APCVD) for the synthesis of large size (>100 μm) single crystals of atomically thin tungsten disulfide (WS2), a member of TMD family, on sapphire substrate. More importantly, we demonstrate a polystyrene (PS) mediated delamination process via capillary force in water which reduces the etching time in base solution and imposes only minor damage to the sapphire substrate. The transferred WS2 flakes are of excellent continuity and exhibit comparable electron mobility after several growth cycles on the reused sapphire substrate. Interestingly, the photoluminescence emission from WS2 grown on the recycled sapphire is much higher than that on fresh sapphire, possibly due to p-type doping of monolayer WS2 flakes by a thin layer of water intercalated at the atomic steps of the recycled sapphire substrate. The growth and transfer techniques described here are expected to be applicable to other atomically thin TMD materials. PMID:25961515

  4. Comparison of stress states in GaN films grown on different substrates: Langasite, sapphire and silicon

    NASA Astrophysics Data System (ADS)

    Park, Byung-Guon; Saravana Kumar, R.; Moon, Mee-Lim; Kim, Moon-Deock; Kang, Tae-Won; Yang, Woo-Chul; Kim, Song-Gang

    2015-09-01

    We demonstrate the evolution of GaN films on novel langasite (LGS) substrate by plasma-assisted molecular beam epitaxy, and assessed the quality of grown GaN film by comparing the experimental results obtained using LGS, sapphire and silicon (Si) substrates. To study the substrate effect, X-ray diffraction (XRD), scanning electron microscopy (SEM), Raman spectroscopy and photoluminescence (PL) spectra were used to characterize the microstructure and stress states in GaN films. Wet etching of GaN films in KOH solution revealed that the films deposited on GaN/LGS, AlN/sapphire and AlN/Si substrates possess Ga-polarity, while the film deposited on GaN/sapphire possess N-polarity. XRD, Raman and PL analysis demonstrated that a compressive stress exist in the films grown on GaN/LGS, AlN/sapphire, and GaN/sapphire substrates, while a tensile stress appears on AlN/Si substrate. Comparative analysis showed the growth of nearly stress-free GaN films on LGS substrate due to the very small lattice mismatch (~3.2%) and thermal expansion coefficient difference (~7.5%). The results presented here will hopefully provide a new framework for the further development of high performance III-nitride-related devices using GaN/LGS heteroepitaxy.

  5. Microstructural properties and dislocation evolution on a GaN grown on patterned sapphire substrate: A transmission electron microscopy study

    NASA Astrophysics Data System (ADS)

    Kim, Y. H.; Ruh, H.; Noh, Y. K.; Kim, M. D.; Oh, J. E.

    2010-03-01

    The microstructural properties of a GaN layer grown on a patterned sapphire substrate (PSS) were studied in detail using transmission electron microscope techniques to determine dislocation and growth behaviors. Regular and uniform recrystallized GaN islands were observed on the protruding pattern. On a flat sapphire surface, the crystallographic orientation relationship of ⟨1¯21¯0⟩GaN on FS//⟨11¯00⟩sapphire and {11¯01}GaN on FS//{12¯13}sapphire existed between the GaN and the substrate. On the other hand, the orientation relationship of ⟨1¯21¯0⟩GaN layer//⟨1¯21¯0⟩GaN island on IS//⟨11¯00⟩sapphire and {11¯01}GaN layer//{0002}GaN island on IS//{12¯13}sapphire was confirmed among the GaN layer, the recrystallized GaN islands on an inclined sapphire surface and the PSS. The flat surface among the protruding patterns began to fill rapidly with GaN. Then, the GaN gradually overgrew the protruding pattern and coalesced near the summit as the growth time increased. The generation of threading dislocations was observed in the vicinity of the coalescence points near the top of the protruding patterns.

  6. Comparison of Strain in GaN-Based Blue Light-Emitting Diode Grown on Silicon(111) and Sapphire Substrates.

    PubMed

    Jeon, K S; Sung, J H; Lee, M W; Song, H Y; Lee, E A; Kim, S O; Choi, H J; Shin, H Y; Park, W H; Jang, Y I; Kang, M G; Choi, Y H; Lee, J S; Ko, D H; Ryu, H Y

    2015-07-01

    We compare the strain states and device performances of GaN-based blue light-emitting diodes (LEDs) grown on Si(111) and sapphire substrates. The strain characteristics are investigated using micro-Raman spectroscopy and high-resolution transmission electron microscopy. These analyses reveal that GaN layer grown on Si has a residual tensile strain in contrast to a compressive strain for GaN on sapphire, and quantum wells (QWs) on GaN/Si experience reduced lattice mismatch than those of GaN/sapphire. When external quantum efficiencies of LED on sapphire and Si substrates are compared, the LED on Si shows better efficiency droop characteristics and this is attributed to a decrease in piezo-electric field strength in InGaN/GaN layers owing to reduced lattice mismatch.

  7. Selective growth of tilted ZnO nanoneedles and nanowires by PLD on patterned sapphire substrates

    NASA Astrophysics Data System (ADS)

    Shkurmanov, Alexander; Sturm, Chris; Lenzner, Jörg; Feuillet, Guy; Tendille, Florian; De Mierry, Philippe; Grundmann, Marius

    2016-09-01

    We report the possibility to control the tilting of nanoneedles and nanowires by using structured sapphire substrates. The advantage of the reported strategy is to obtain well oriented growth along a single direction tilted with respect to the surface normal, whereas the growth in other directions is suppressed. In our particular case, the nanostructures are tilted with respect to the surface normal by an angle of 58 ° . Moreover, we demonstrate that variation of the nanostructures shape from nanoneedles to cylindrical nanowires by using SiO2 layer is observed.

  8. Microstructure of nitrides grown on inclined c-plane sapphire and SiC substrate

    NASA Astrophysics Data System (ADS)

    Imura, M.; Honshio, A.; Miyake, Y.; Nakano, K.; Tsuchiya, N.; Tsuda, M.; Okadome, Y.; Balakrishnan, K.; Iwaya, M.; Kamiyama, S.; Amano, H.; Akasaki, I.

    2006-04-01

    High-quality (1 1 2bar 0) GaN layers with atomically flat surface have been grown on a precisely offset-angle-controlled (1 1bar 0 2) sapphire substrate by metal-organic vapor phase epitaxy (MOVPE). Insertion of AlGaN layer between underlying AlN layer and GaN was found to improve crystalline quality of upper GaN layer. In addition, a combination of high growth condition followed and epitaxial lateral overgrowth has been employed for the growth of GaN and this helped in reducing the dislocation density in the resultant layers. GaN and AlN were grown on (3 0 3bar 8) SiC substrates by MOVPE and sublimation methods, respectively. The crystal orientation of GaN and AlN could be just aligned to that of the substrate. Microstructure analysis of the layers was also carried out by transmission electron microscopy.

  9. Growth and crystallographic characterization of molecular beam epitaxial WO3 and MoO3/WO3 thin films on sapphire substrates

    NASA Astrophysics Data System (ADS)

    Yano, Mitsuaki; Koike, Kazuto; Matsuo, Masayuki; Murayama, Takayuki; Harada, Yoshiyuki; Inaba, Katsuhiko

    2016-09-01

    Molecular beam epitaxy of tungsten trioxide (WO3) on (01 1 bar 2)-oriented (r-plane) sapphire substrates and molybdenum trioxide (MoO3) on the WO3 was studied by focusing on their crystallogrhaphic properties. Although polycrystalline monoclinic (γ-phase) WO3 films were grown at 500 °C and they became single-crystalline (0 0 1)-oriented γ-phase at 700 °C, the latter films were oxygen-deficient from stoichiometry and contained dense and deep thermal etchpits. By using a two-step growth method where only the initial 15 nm was grown at 700 °C and the rest part was grown at 500 °C, (0 0 1)-oriented γ-phase single-crystalline WO3 films with stoichiometric composition and smooth surface were obtained. On top of the 15-nm-thick WO3 initiation layer, (1 1 0)-oriented orthorhombic (α-phase) MoO3 films with smooth surface were obtained.

  10. Graphite Thin Films Consisting of Nanograins of Multilayer Graphene on Sapphire Substrates Directly Grown by Alcohol Chemical Vapor Deposition

    NASA Astrophysics Data System (ADS)

    Miyasaka, Yuta; Nakamura, Atsushi; Temmyo, Jiro

    2011-04-01

    Graphene has been attracting a strong interest as a transparent electrode as well as a THz nanoelectronic device owing to its unique properties. To date, large-area graphene growth has been realized by chemical vapor deposition (CVD) with a catalyst metal. To avoid the transfer of segregated graphene, we have examined directly graphite thin film growth on nonpolar a-sapphire substrates without any catalyst metal by alcohol CVD. Graphite thin films consisting of nanograins of multilayer graphene on a-sapphire substrates were verified by a combination of transmission electron spectroscopy (TEM), and Raman analyses, and optical transparent and sheet resistance measurements.

  11. YBCO High-Temperature Superconducting Filters on M-Plane Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Sabataitis, J. C.; Mueller, C. H.; Miranda, F. A.; Warner, J.; Bhasin, K. B.

    1996-01-01

    Since the discovery of High Temperature Superconductors (HTS) in 1986, microwave circuits have been demonstrated using HTS films on various substrates. These HTS-based circuits have proven to operate with less power loss than their metallic film counterparts at 77 K. This translates into smaller and lighter microwave circuits for space communication systems such as multiplexer filter banks. High quality HTS films have conventionally been deposited on lanthanum aluminate (LaAlO3) substrates. However, LaAlO3 has a relative dielectric constant (epsilon(sub r)) of 24. With a epsilon(sub r) approx. 9.4-11.6, sapphire (Al2O3) would be a preferable substrate for the fabrication of HTS-based components since the lower dielectric constant would permit wider microstrip lines to be used in filter design, since the lower dielectric constant would permit wider microstrip lines to be used for a given characteristic impedance (Z(sub 0)), thus lowering the insertion losses and increasing the power handling capabilities of the devices. We report on the fabrication and characterization of YBa2Cu3O(7-delta) (YBCO) on M-plane sapphire bandpass filters at 4.0 GHz. For a YBCO 'hairpin' filter, a minimum insertion loss of 0.5 dB was measured at 77 K as compared with 1.4 dB for its gold counterpart. In an 'edge-coupled' configuration, the insertion loss went down from 0.9 dB for the gold film to 0.8 dB for the YBCO film at the same temperature.

  12. Transmission Electron Microscopy (TEM) Sample Preparation of Si(1-x)Gex in c-Plane Sapphire Substrate

    NASA Technical Reports Server (NTRS)

    Kim, Hyun Jung; Choi, Sang H.; Bae, Hyung-Bin; Lee, Tae Woo

    2012-01-01

    The National Aeronautics and Space Administration-invented X-ray diffraction (XRD) methods, including the total defect density measurement method and the spatial wafer mapping method, have confirmed super hetero epitaxy growth for rhombohedral single crystalline silicon germanium (Si1-xGex) on a c-plane sapphire substrate. However, the XRD method cannot observe the surface morphology or roughness because of the method s limited resolution. Therefore the authors used transmission electron microscopy (TEM) with samples prepared in two ways, the focused ion beam (FIB) method and the tripod method to study the structure between Si1-xGex and sapphire substrate and Si1?xGex itself. The sample preparation for TEM should be as fast as possible so that the sample should contain few or no artifacts induced by the preparation. The standard sample preparation method of mechanical polishing often requires a relatively long ion milling time (several hours), which increases the probability of inducing defects into the sample. The TEM sampling of the Si1-xGex on sapphire is also difficult because of the sapphire s high hardness and mechanical instability. The FIB method and the tripod method eliminate both problems when performing a cross-section TEM sampling of Si1-xGex on c-plane sapphire, which shows the surface morphology, the interface between film and substrate, and the crystal structure of the film. This paper explains the FIB sampling method and the tripod sampling method, and why sampling Si1-xGex, on a sapphire substrate with TEM, is necessary.

  13. High Electron Mobility in SiGe/Si n-MODFET Structures on Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Mueller, Carl H.; Croke, Edward T.; Alterovitz, Samuel A.

    2003-01-01

    For the first time, SiGe/Si n-Modulation Doped Field Effect Transistors (n-MODFET) structures have been grown on sapphire substrates. Room temperature electron mobility value of 1271 square centimeters N-sec at an electron carrier density (n(sub e) = 1.33x10(exp 12) per square centimeter)) of 1.6 x 10(exp 12) per square centimeter was obtained. At 250 mK, the mobility increases to 13,313 square centimeters/V-sec (n(sub e)=1.33x10(exp 12) per square centimeter)) and Shubnikov-de Haas oscillations appear, showing excellent confinement of the two-dimensional electron gas.

  14. High-T(sub c) Edge-geometry SNS Weak Links on Silicon-on-sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Hunt, B.; Foote, M.; Pike, W.; Barner, J.; Vasquez, R.

    1994-01-01

    High-quality superconductor/normal-metal/superconductor(SNS) edge-geometry weak links have been produced on silicon-on-sapphire (SOS) substrates using a new SrTiO(sub 3)/'seed layer'/cubic-zirconia (YS2) buffer system.

  15. Introduction of the moth-eye patterned sapphire substrate technology for cost-effective high-performance LEDs

    NASA Astrophysics Data System (ADS)

    Naniwae, K.; Mori, M.; Kondo, T.; Suzuki, A.; Kitano, T.; Kamiyama, S.; Iwaya, M.; Takeuchi, T.; Akasaki, I.

    2013-03-01

    The improvement of the performance and the reduction of the cost for LEDs using the moth-eye patterned sapphire substrate (MPSS) were investigated. TEM and CL observation results clearly show that the MPSS can provide a thinner GaN template of equal or higher quality than the micron scale patterned sapphire substrate (PSS) since the MPSS only has a submicron scale structure. A 3-μm-thick high quality GaN template on the MPSS with a dislocation density of 1.9×108 cm-2 has been demonstrated. The LEDs on MPSS with a 600 nm pitch show the highest light output among the evaluated LEDs on various types of substrates as it is 1.52 times higher than that on flat sapphire substrate (FSS) and 1.18 times higher than that on PSS. The pitch dependence of the light output improvement is in excellent agreement with that of the transmittance at GaN/sapphire interface simulated by the rigorous coupled wave analysis. As a result of comparisons for the GaN templates and LEDs on MPSS, PSS and FSS, it can be concluded that MPSS provides the most cost effective solution for high performance LED.

  16. High Mobility SiGe/Si Transistor Structures on Sapphire Substrates Using Ion Implantation

    NASA Technical Reports Server (NTRS)

    Alterovitz, S. A.; Mueller, C. H.; Croke, E. T.

    2003-01-01

    High mobility n-type SiGe/Si transistor structures have been fabricated on sapphire substrates by ion implanting phosphorus ions into strained 100 Angstrom thick silicon channels for the first time. The strained Si channels were sandwiched between Si(sub 0.7)Ge(sub 0.3) layers, which, in turn, were deposited on Si(sub 0.7)Ge(sub 0.3) virtual substrates and graded SiGe buffer layers. After the molecular beam epitaxy (MBE) film growth process was completed, ion thick silicon channels implantation and post-annealing were used to introduce donors. The phosphorous ions were preferentially located in the Si channel at a peak concentration of approximately 1x10(exp 18)/cu cm. Room temperature electron mobilities exceeding 750 sq cm/V-sec at carrier densities of 1x10(exp 12)/sq cm were measured. Electron concentration appears to be the key factor that determines mobility, with the highest mobility observed for electron densities in the 1 - 2x10(exp 12)/sq cm range.

  17. AlN/GaN high electron mobility transistors on sapphire substrates for Ka band applications

    NASA Astrophysics Data System (ADS)

    Xubo, Song; Yuanjie, Lü; Guodong, Gu; Yuangang, Wang; Xin, Tan; Xingye, Zhou; Shaobo, Dun; Peng, Xu; Jiayun, Yin; Bihua, Wei; Zhihong, Feng; Shujun, Cai

    2016-04-01

    We report the DC and RF characteristics of AlN/GaN high electron mobility transistors (HEMTs) with the gate length of 100 nm on sapphire substrates. The device exhibits a maximum drain current density of 1.29 A/mm and a peak transconductance of 440 mS/mm. A current gain cutoff frequency and a maximum oscillation frequency of 119 GHz and 155 GHz have been obtained, respectively. Furthermore, the large signal load pull characteristics of the AlN/GaN HEMTs were measured at 29 GHz. An output power density of 429 mW/mm has been demonstrated at a drain bias of 10 V. To the authors' best knowledge, this is the earliest demonstration of power density at the Ka band for AlN/GaN HEMTs in the domestic, and also a high frequency of load-pull measurements for AlN/GaN HEMTs. Project supported by the National Natural Science Foundation of China (No. 61306113).

  18. Unstrained InAlN/GaN heterostructures grown on sapphire substrates by MOCVD

    NASA Astrophysics Data System (ADS)

    Bo, Liu; Jiayun, Yin; Yuanjie, Lü; Shaobo, Dun; Xiongwen, Zhang; Zhihong, Feng; Shujun, Cai

    2014-11-01

    InAlN/GaN heterostructures were grown on sapphire substrates by low-pressure metal organic chemical vapor deposition. The influences of NH3 flux and growth temperature on the In composition and morphologies of the InAlN were investigated by X-ray diffraction and atomic force microscopy. It's found that the In composition increases quickly with NH3 flux decrease. But it's not sensitive to NH3 flux under higher flux. This suggests that lower NH3 flux induces a higher growth rate and an enhanced In incorporation. The In composition also increases with the growth temperatures decreasing, and the defects of the InAlN have close relation with In composition. Unstrained InAlN with In composition of 17% is obtained at NH3 flux of 500 sccm and growth temperature of 790 °C. The InAlN/GaN heterostructure high electron mobility transistor sample showed a high two-dimensional electron gas (2DEG) mobility of 1210 cm2/(V·s) with the sheet density of 2.3 × 1013 cm-2 at room temperature.

  19. Design of patterned sapphire substrates for GaN-based light-emitting diodes

    NASA Astrophysics Data System (ADS)

    Wang, Hai-Yan; Lin, Zhi-Ting; Han, Jing-Lei; Zhong, Li-Yi; Li, Guo-Qiang

    2015-06-01

    A new method for patterned sapphire substrate (PSS) design is developed and proven to be reliable and cost-effective. As progress is made with LEDs’ luminous efficiency, the pattern units of PSS become more complicated, and the effect of complicated geometrical features is almost impossible to study systematically by experiments only. By employing our new method, the influence of pattern parameters can be systematically studied, and various novel patterns are designed and optimized within a reasonable time span, with great improvement in LEDs’ light extraction efficiency (LEE). Clearly, PSS pattern design with such a method deserves particular attention. We foresee that GaN-based LEDs on these newly designed PSSs will achieve more progress in the coming years. Project supported by the National Natural Science Fundation for Excellent Young Scholars of China (Grant No. 51422203), the National Natural Science Foundation of China (Grant No. 51372001), the Outstanding Youth Foundation of Guangdong Scientific Committee (Grant No. S2013050013882), and the Strategic Special Funds for LEDs of Guangdong Province, China (Grant Nos. 2011A081301010, 2011A081301012, 2012A080302002, and 2012A080302004).

  20. Fabrication of volcano-shaped nano-patterned sapphire substrates using colloidal self-assembly and wet chemical etching.

    PubMed

    Geng, Chong; Zheng, Lu; Fang, Huajing; Yan, Qingfeng; Wei, Tongbo; Hao, Zhibiao; Wang, Xiaoqing; Shen, Dezhong

    2013-08-23

    Patterned sapphire substrates (PSS) have been widely used to enhance the light output power in GaN-based light emitting diodes. The shape and feature size of the pattern in a PSS affect its enhancement efficiency to a great degree. In this work we demonstrate the nanoscale fabrication of volcano-shaped PSS using a wet chemical etching approach in combination with a colloidal monolayer templating strategy. Detailed analysis by scanning electron microscopy reveals that the unique pattern shape is a result of the different corrosion-resistant abilities of silica masks of different effective heights during wet chemical etching. The formation of silica etching masks of different effective heights has been ascribed to the silica precursor solution in the interstice of the colloidal monolayer template being distributed unevenly after infiltration. In the subsequent wet chemical etching process, the active reaction sites altered as etching duration was prolonged, resulting in the formation of volcano-shaped nano-patterned sapphire substrates.

  1. Fabrication and characterization of nitride-based blue light-emitting diodes on moth-eye patterned sapphire substrate (MPSS)

    NASA Astrophysics Data System (ADS)

    Tsuchiya, T.; Umeda, S.; Sowa, Mihoko; Kondo, T.; Kitano, T.; Mori, M.; Suzuki, A.; Naniwae, K.; Sekine, H.; Iwaya, M.; Takeuchi, T.; Kamiyama, S.; Akasaki, I.

    2013-03-01

    The fabrication procedure of a moth-eye patterned sapphire substrate (MPSS), which can enhance the light extraction efficiency of nitride-based light emitting diodes (LEDs) has been examined. The optimization of surface morphology after the etching of the MPSS for high-quality GaN growth was also performed. Then, we fabricated MPSS samples with a fixed pitch of 460nm, and corn height ranging from 50 to 350nm. The light extraction efficiency of blue-LEDs grown on a series of MPSS was enhanced about 1.4 times compared with the devices grown on a flat sapphire substrate. We found that if corn height exceeds 150nm, the MPSS effect is sufficiently observed.

  2. Heteroepitaxial growth of Cu{sub 2}ZnSnS{sub 4} thin film on sapphire substrate by radio frequency magnetron sputtering

    SciTech Connect

    Song, Ning E-mail: n.song@student.unsw.edu.au; Huang, Yidan; Li, Wei; Huang, Shujuan; Hao, Xiaojing E-mail: n.song@student.unsw.edu.au; Wang, Yu; Hu, Yicong

    2014-03-03

    The heteroepitaxy of tetragonal Cu2ZnSnS4 (CZTS) thin films on hexagonal sapphire (0001) single crystal substrates is successfully obtained by radio frequency magnetron sputtering. The sputtered CZTS film has a mirror-like smooth surface with a root mean square roughness of about 5.44 nm. X-ray θ-2θ scans confirm that CZTS film is (112) oriented on sapphire with an out of plane arrangement of CZTS (112) ‖ sapphire (0001). X-ray Phi scan further illustrates an in plane ordering of CZTS [201{sup ¯}] ‖ sapphire [21{sup ¯}1{sup ¯}0]. The high resolution transmission electron microscopy image of the interface region clearly shows that the CZTS thin film epitaxially grows on the sapphire (0001) substrate. The band gap of the film is found to be approximately 1.51 eV.

  3. Dependence of adhesion strength between GaN LEDs and sapphire substrate on power density of UV laser irradiation

    NASA Astrophysics Data System (ADS)

    Park, Junsu; Sin, Young-Gwan; Kim, Jae-Hyun; Kim, Jaegu

    2016-10-01

    Selective laser lift-off (SLLO) is an innovative technology used to manufacture and repair micro-light-emitting diode (LED) displays. In SLLO, laser is irradiated to selectively separate micro-LED devices from a transparent sapphire substrate. The light source used is an ultraviolet (UV) laser with a wavelength of 266 nm, pulse duration of 20 ns, and repetition rate of 30 kHz. Controlled adhesion between a LED and the substrate is key for a SLLO process with high yield and reliability. This study examined the fundamental relationship between adhesion and laser irradiation. Two competing mechanisms affect adhesion at the irradiated interface between the GaN LED and sapphire substrate: Ga precipitation caused by the thermal decomposition of GaN and roughened interface caused by thermal damage on the sapphire. The competition between these two mechanisms leads to a non-trivial SLLO condition that needs optimization. This study helps understand the SLLO process, and accelerate the development of a process for manufacturing micro-LED displays via SLLO for future applications.

  4. Influence of the microstructure geometry of patterned sapphire substrates on the light extraction efficiency of GaN LEDs.

    PubMed

    Kuo, Chien-Ting; Hsu, Lung-Hsing; Huang, Bo-Hsin; Kuo, Hao-Chung; Lin, Chien-Chung; Cheng, Yuh-Jen

    2016-09-10

    The influence of the microstructure geometry of patterned sapphire substrates (PSS) on the light extraction efficiency (LEE) of GaN light-emitting diodes (LEDs) is numerically analyzed. Cone structures of various dimensions are studied, along with dome and mixed microstructures. LEE is found to mainly depend on the microstructure surface slope. LEE rises quickly with slope and flattens out when the slope exceeds 0.6. Scaling down the microstructure has little effect on LEE. Light rays are found to travel longer distances in PSS LEDs, as compared with LEDs grown on a flat substrate. Keeping GaN absorption loss low is important for LEE optimization. PMID:27661378

  5. Semipolar (202{sup ¯}1) GaN and InGaN quantum wells on sapphire substrates

    SciTech Connect

    Leung, Benjamin; Wang, Dili; Kuo, Yu-Sheng; Xiong, Kanglin; Song, Jie; Chen, Danti; Park, Sung Hyun; Han, Jung; Hong, Su Yeon; Choi, Joo Won

    2014-06-30

    Here, we demonstrate a process to produce planar semipolar (202{sup ¯}1) GaN templates on sapphire substrates. We obtain (202{sup ¯}1) oriented GaN by inclined c-plane sidewall growth from etched sapphire, resulting in single crystal material with on-axis x-ray diffraction linewidth below 200 arc sec. The surface, composed of (101{sup ¯}1) and (101{sup ¯}0) facets, is planarized by the chemical-mechanical polishing of full 2 in. wafers, with a final surface root mean square roughness of <0.5 nm. We then analyze facet formation and roughening mechanisms on the (202{sup ¯}1) surface and establish a growth condition in N{sub 2} carrier gas to maintain a planar surface for further device layer growth. Finally, the capability of these semipolar (202{sup ¯}1) GaN templates to produce high quality device structures is verified by the growth and characterization of InGaN/GaN multiple quantum well structures. It is expected that the methods shown here can enable the benefits of using semipolar orientations in a scalable and practical process and can be readily extended to achieve devices on surfaces using any orientation of semipolar GaN on sapphire.

  6. Neutron reflectivity study of substrate surface chemistry effects on supported phospholipid bilayer formation on (1120) sapphire.

    SciTech Connect

    Oleson, Timothy A.; Sahai, Nita; Wesolowski, David J; Dura, Joseph A; Majkrzak, Charles F; Giuffre, Anthony J.

    2012-01-01

    Oxide-supported phospholipid bilayers (SPBs) used as biomimetric membranes are significant for a broad range of applications including improvement of biomedical devices and biosensors, and in understanding biomineralization processes and the possible role of mineral surfaces in the evolution of pre-biotic membranes. Continuous-coverage and/or stacjed SPBs retain properties (e.,g. fluidity) more similar to native biological membranes, which is desirable for most applications. Using neutron reflectivity, we examined face coverage and potential stacking of dipalmitoylphosphatidylcholine (DPPC) bilayers on the (1120) face of sapphire (a-Al2O3). Nearly full bilayers were formed at low to neutral pH, when the sapphire surface is positively charged, and at low ionic strength (l=15 mM NaCl). Coverage decreased at higher pH, close to the isoelectric point of sapphire, and also at high I>210mM, or with addition of 2mM Ca2+. The latter two effects are additive, suggesting that Ca2+ mitigates the effect of higher I. These trends agree with previous results for phospholipid adsorption on a-Al2O3 particles determined by adsorption isotherms and on single-crystal (1010) sapphire by atomic force microscopy, suggesting consistency of oxide surface chemistry-dependent effects across experimental techniques.

  7. Development and Industrialization of InGaN/GaN LEDs on Patterned Sapphire Substrates for Low Cost Emitter Architecture

    SciTech Connect

    Flemish, Joseph; Soer, Wouter

    2015-11-30

    Patterned sapphire substrate (PSS) technology has proven to be an effective approach to improve efficacy and reduce cost of light-emitting diodes (LEDs). The volume emission from the transparent substrate leads to high package efficiency, while the simple and robust architecture of PSS-based LEDs enables low cost. PSS substrates have gained wide use in mid-power LEDs over the past years. In this project, Lumileds has developed and industrialized PSS and epitaxy technology for high- power flip-chip LEDs to bring these benefits to a broader range of applications and accelerate the adoption of energy-efficient solid-state lighting (SSL). PSS geometries were designed for highly efficient light extraction in a flip-chip architecture and high-volume manufacturability, and corresponding sapphire patterning and epitaxy manufacturing processes were integrally developed. Concurrently, device and package architectures were developed to take advantage of the PSS flip-chip die in different types of products that meet application needs. The developed PSS and epitaxy technology has been fully implemented in manufacturing at Lumileds’ San Jose, CA location, and incorporated in illumination-grade LED products that have been successfully introduced to the market, including LUXEON Q and LUXEON FlipChip White.

  8. Nanomechanical probing of the layer/substrate interface of an exfoliated InSe sheet on sapphire.

    PubMed

    Beardsley, Ryan; Akimov, Andrey V; Greener, Jake D G; Mudd, Garry W; Sandeep, Sathyan; Kudrynskyi, Zakhar R; Kovalyuk, Zakhar D; Patanè, Amalia; Kent, Anthony J

    2016-01-01

    Van der Waals (vdW) layered crystals and heterostructures have attracted substantial interest for potential applications in a wide range of emerging technologies. An important, but often overlooked, consideration in the development of implementable devices is phonon transport through the structure interfaces. Here we report on the interface properties of exfoliated InSe on a sapphire substrate. We use a picosecond acoustic technique to probe the phonon resonances in the InSe vdW layered crystal. Analysis of the nanomechanics indicates that the InSe is mechanically decoupled from the substrate and thus presents an elastically imperfect interface. A high degree of phonon isolation at the interface points toward applications in thermoelectric devices, or the inclusion of an acoustic transition layer in device design. These findings demonstrate basic properties of layered structures and so illustrate the usefulness of nanomechanical probing in nanolayer/nanolayer or nanolayer/substrate interface tuning in vdW heterostructures.

  9. Nanomechanical probing of the layer/substrate interface of an exfoliated InSe sheet on sapphire

    NASA Astrophysics Data System (ADS)

    Beardsley, Ryan; Akimov, Andrey V.; Greener, Jake D. G.; Mudd, Garry W.; Sandeep, Sathyan; Kudrynskyi, Zakhar R.; Kovalyuk, Zakhar D.; Patanè, Amalia; Kent, Anthony J.

    2016-06-01

    Van der Waals (vdW) layered crystals and heterostructures have attracted substantial interest for potential applications in a wide range of emerging technologies. An important, but often overlooked, consideration in the development of implementable devices is phonon transport through the structure interfaces. Here we report on the interface properties of exfoliated InSe on a sapphire substrate. We use a picosecond acoustic technique to probe the phonon resonances in the InSe vdW layered crystal. Analysis of the nanomechanics indicates that the InSe is mechanically decoupled from the substrate and thus presents an elastically imperfect interface. A high degree of phonon isolation at the interface points toward applications in thermoelectric devices, or the inclusion of an acoustic transition layer in device design. These findings demonstrate basic properties of layered structures and so illustrate the usefulness of nanomechanical probing in nanolayer/nanolayer or nanolayer/substrate interface tuning in vdW heterostructures.

  10. Nanomechanical probing of the layer/substrate interface of an exfoliated InSe sheet on sapphire.

    PubMed

    Beardsley, Ryan; Akimov, Andrey V; Greener, Jake D G; Mudd, Garry W; Sandeep, Sathyan; Kudrynskyi, Zakhar R; Kovalyuk, Zakhar D; Patanè, Amalia; Kent, Anthony J

    2016-01-01

    Van der Waals (vdW) layered crystals and heterostructures have attracted substantial interest for potential applications in a wide range of emerging technologies. An important, but often overlooked, consideration in the development of implementable devices is phonon transport through the structure interfaces. Here we report on the interface properties of exfoliated InSe on a sapphire substrate. We use a picosecond acoustic technique to probe the phonon resonances in the InSe vdW layered crystal. Analysis of the nanomechanics indicates that the InSe is mechanically decoupled from the substrate and thus presents an elastically imperfect interface. A high degree of phonon isolation at the interface points toward applications in thermoelectric devices, or the inclusion of an acoustic transition layer in device design. These findings demonstrate basic properties of layered structures and so illustrate the usefulness of nanomechanical probing in nanolayer/nanolayer or nanolayer/substrate interface tuning in vdW heterostructures. PMID:27256805

  11. Nanomechanical probing of the layer/substrate interface of an exfoliated InSe sheet on sapphire

    PubMed Central

    Beardsley, Ryan; Akimov, Andrey V.; Greener, Jake D. G.; Mudd, Garry W.; Sandeep, Sathyan; Kudrynskyi, Zakhar R.; Kovalyuk, Zakhar D.; Patanè, Amalia; Kent, Anthony J.

    2016-01-01

    Van der Waals (vdW) layered crystals and heterostructures have attracted substantial interest for potential applications in a wide range of emerging technologies. An important, but often overlooked, consideration in the development of implementable devices is phonon transport through the structure interfaces. Here we report on the interface properties of exfoliated InSe on a sapphire substrate. We use a picosecond acoustic technique to probe the phonon resonances in the InSe vdW layered crystal. Analysis of the nanomechanics indicates that the InSe is mechanically decoupled from the substrate and thus presents an elastically imperfect interface. A high degree of phonon isolation at the interface points toward applications in thermoelectric devices, or the inclusion of an acoustic transition layer in device design. These findings demonstrate basic properties of layered structures and so illustrate the usefulness of nanomechanical probing in nanolayer/nanolayer or nanolayer/substrate interface tuning in vdW heterostructures. PMID:27256805

  12. The effect of inductively-coupled-plasma reactive ion etching power on the etching rate and the surface roughness of a sapphire substrate.

    PubMed

    Chang, Chun-Ming; Shiao, Ming-Hua; Yang, Chin-Tien; Cheng, Chung-Ta; Hsueh, Wen-Jeng

    2014-10-01

    In this study, patterned sapphire substrates are fabricated using nanosphere lithography (NSL) and inductively-coupled-plasma reactive ion etching (ICP-RIE). Polystyrene nanospheres of approximately 600 nm diameter are self-assembled on c-plane sapphire substrates by spin-coating. The diameter of the polystyrene nanospheres is modified to adjust the etching mask pitch cycle using oxygen plasma in the ICP-RIE system. A nickel thin film mask of 100 nm thickness is deposited by electron-beam evaporation on a substrate covered with treated nanospheres. The sapphire substrate is then etched in an inductively coupled plasma system using BCl3/Ar gas, to fabricate a structure with a periodic sub-micron hole array with different sidewall intervals. The DC bias voltage, the sapphire etching rate, the surface roughness, are studied as a function of the ICP and the RF power. Different sub-micron hole arrays with spacing cycles of 89 nm, 139 nm and 167 nm are successfully fabricated on the sapphire substrate, using suitable etching parameters. PMID:25942926

  13. Substrate-induced disorder in V{sub 2}O{sub 3} thin films grown on annealed c-plane sapphire substrates

    SciTech Connect

    Brockman, J.; Samant, M. G.; Roche, K. P.; Parkin, S. S. P.

    2012-07-30

    We investigate the structural and electronic properties of V{sub 2}O{sub 3} thin films deposited by oxygen plasma-assisted molecular beam epitaxy onto annealed and unannealed c-plane sapphire substrates. Annealing the substrates before growth to produce ultra-smooth surfaces improved initial epitaxy, according to in situ reflection high-energy electron diffraction. Surprisingly, films deposited on annealed substrates had a more island-like surface, broader x-ray diffraction peaks, and an increased resistivity of V{sub 2}O{sub 3}'s normally metallic high-temperature phase. We attribute these results to enhanced strain coupling at the interface between the substrate and film, highlighting the vulnerability of V{sub 2}O{sub 3}'s strongly correlated metallic phase to crystalline defects and structural disorder.

  14. Air-void embedded GaN-based light-emitting diodes grown on laser drilling patterned sapphire substrates

    NASA Astrophysics Data System (ADS)

    Liu, Hao; Li, Yufeng; Wang, Shuai; Feng, Lungang; Xiong, Han; Su, Xilin; Yun, Feng

    2016-07-01

    Air-void structure was introduced in GaN-based blue light-emitting diodes (LED) with one-step growth on periodic laser drilling patterned sapphire substrate, which free of any photolithography or wet/dry etching process. The influence of filling factors (FF) of air-void on crystal quality and optical performance were investigate. Transmission electron microscopy images and micro-Raman spectroscopy indicated that the dislocation was bended and the partially compressed strain was released. When FF was 55.43%, compared with the LED structure grown on flat sapphire substrate, the incorporation of air-void was observed to reduce the compressed stress of ˜20% and the luminance intensity has improved by 128%. Together with the simulated reflection intensity enhancement by finite difference time-domain (FDTD) method, we attribute the enhanced optical performance to the combined contribution of strong back-side light reflection of air-void and better GaN epitaxial quality. This approach provides a simple replacement to the conventional air-void embedded LED process.

  15. The effect of substrate on high-temperature annealing of GaN epilayers: Si versus sapphire

    SciTech Connect

    Pastor, D.; Cusco, R.; Artus, L.; Gonzalez-Diaz, G.; Iborra, E.; Jimenez, J.; Peiro, F.; Calleja, E.

    2006-08-15

    We have studied the effects of rapid thermal annealing at 1300 deg.C on GaN epilayers grown on AlN buffered Si(111) and on sapphire substrates. After annealing, the epilayers grown on Si display visible alterations with craterlike morphology scattered over the surface. The annealed GaN/Si layers were characterized by a range of experimental techniques: scanning electron microscopy, optical confocal imaging, energy dispersive x-ray microanalysis, Raman scattering, and cathodoluminescence. A substantial Si migration to the GaN epilayer was observed in the crater regions, where decomposition of GaN and formation of Si{sub 3}N{sub 4} crystallites as well as metallic Ga droplets and Si nanocrystals have occurred. The average diameter of the Si nanocrystals was estimated from Raman scattering to be around 3 nm. Such annealing effects, which are not observed in GaN grown on sapphire, are a significant issue for applications of GaN grown on Si(111) substrates when subsequent high-temperature processing is required.

  16. Highly efficient and reliable high power LEDs with patterned sapphire substrate and strip-shaped distributed current blocking layer

    NASA Astrophysics Data System (ADS)

    Zhou, Shengjun; Yuan, Shu; Liu, Yingce; Guo, L. Jay; Liu, Sheng; Ding, Han

    2015-11-01

    We demonstrated that the improvement in optical and electrical performance of high power LEDs was achieved using cone-shaped patterned sapphire substrate (PSS) and strip-shaped SiO2 distributed current blocking layer (DCBL). We found through transmission electron microscopy (TEM) observation that densities of both the screw dislocation and edge dislocation existing in GaN epitaxial layer grown on PSS were much less than that of GaN epitaxial layer grown on flat sapphire substrate (FSS). Compared to LED grown on FSS, LED grown on PSS showed higher sub-threshold forward-bias voltage and lower reverse leakage current, resulting in an enhancement in device reliability. We also designed a strip-shaped SiO2 DCBL beneath a strip-shaped p-electrode, which prevents the current from being concentrated on regions immediately adjacent the strip-shaped p-electrode, thereby facilitating uniform current spreading into the active region. By implementing strip-shaped SiO2 DCBL, light output power of high power PSS-LED chip could be further increased by 13%.

  17. Fabrication of volcano-shaped nano-patterned sapphire substrates using colloidal self-assembly and wet chemical etching.

    PubMed

    Geng, Chong; Zheng, Lu; Fang, Huajing; Yan, Qingfeng; Wei, Tongbo; Hao, Zhibiao; Wang, Xiaoqing; Shen, Dezhong

    2013-08-23

    Patterned sapphire substrates (PSS) have been widely used to enhance the light output power in GaN-based light emitting diodes. The shape and feature size of the pattern in a PSS affect its enhancement efficiency to a great degree. In this work we demonstrate the nanoscale fabrication of volcano-shaped PSS using a wet chemical etching approach in combination with a colloidal monolayer templating strategy. Detailed analysis by scanning electron microscopy reveals that the unique pattern shape is a result of the different corrosion-resistant abilities of silica masks of different effective heights during wet chemical etching. The formation of silica etching masks of different effective heights has been ascribed to the silica precursor solution in the interstice of the colloidal monolayer template being distributed unevenly after infiltration. In the subsequent wet chemical etching process, the active reaction sites altered as etching duration was prolonged, resulting in the formation of volcano-shaped nano-patterned sapphire substrates. PMID:23881090

  18. The improvement of GaN-based light-emitting diodes using nanopatterned sapphire substrate with small pattern spacing

    SciTech Connect

    Zhang, Yonghui; Wei, Tongbo Wang, Junxi; Chen, Yu; Hu, Qiang; Lu, Hongxi; Li, Jinmin; Lan, Ding

    2014-02-15

    Self-assembly SiO{sub 2} nanosphere monolayer template is utilized to fabricate nanopatterned sapphire substrates (NPSSs) with 0-nm, 50-nm, and 120-nm spacing, receptively. The GaN growth on top of NPSS with 0-nm spacing has the best crystal quality because of laterally epitaxial overgrowth. However, GaN growth from pattern top is more difficult to get smooth surface than from pattern bottom. The rougher surface may result in a higher work voltage. The stimulation results of finite-difference time-domain (FDTD) display that too large or too small spacing lead to the reduced light extracted efficiency (LEE) of LEDs. Under a driving current 350 mA, the external quantum efficiencies (EQE) of GaN-based LEDs grown on NPSSs with 0-nm, 50-nm, and 120-nm spacing increase by 43.3%, 50.6%, and 39.1%, respectively, compared to that on flat sapphire substrate (FSS). The optimized pattern spacing is 50 nm for the NPSS with 600-nm pattern period.

  19. Laser soldering of sapphire substrates using a BaTiAl6O12 thin-film glass sealant

    NASA Astrophysics Data System (ADS)

    de Pablos-Martin, A.; Tismer, S.; Benndorf, G.; Mittag, M.; Lorenz, M.; Grundmann, M.; Höche, Th.

    2016-07-01

    Two sapphire substrates are tightly bonded through a BaTiAl6O12-glass thin film, by irradiation with a nanosecond laser. After the laser process, the composition of the glass sealant changes, due to incorporation of Al2O3 from the upper substrate. After annealing of the bonded samples (950 °C for 30 minutes) crystalline structures are observed by TEM which are attributed to crystalline BaTiAl6O12. These crystals together with Al2O3:Ti centers are the responsible of the observed strong blue luminescence of the laser irradiated region upon UV excitation. The structural and optical characterizations of the bonded samples clarify the laser soldering procedure as well as the origin of the luminescence. Bond quality and bond strength were evaluated by scanning acoustic microscopy (SAM) and tensile tests, which results in a tensile stress of nearly 13 MPa, which is an acceptable value for glass sealants.

  20. Investigation of GaN-Based Light-Emitting Diodes Grown on Patterned Sapphire Substrates by Contact-Transferred and Mask-Embedded Lithography

    NASA Astrophysics Data System (ADS)

    Kao, Chien-Chih; Su, Yan-Kuin; Hsieh, Yi-Ta; Lee, Yung-Chun; Cheng, Chiao-Yang; Lin, Chuing-Liang

    2011-06-01

    The influences of pattern size and etching depth of patterned sapphire substrates (PSSs) on crystal quality and light output power of light-emitting diodes (LEDs) were investigated by contact-transferred and mask-embedded lithography. The present results indicate that a smaller pattern size facilitates superior light extraction efficiency. However, a suitable pattern size and etching depth should be chosen to obtain the highest quality of GaN film. In comparison with the conventional sapphire substrate, the largest light output enhancement (˜28.9%) was observed when the pattern diameter and the etching depth of PSS were 400 and 400 nm, respectively.

  1. High Mobility SiGe/Si n-Type Structures and Field Effect Transistors on Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Alterovitz, Samuel A.; Ponchak, George E.; Mueller, Carl H.; Croke, Edward T.

    2004-01-01

    SiGe/Si n-type modulation doped field effect transistors (MODFETs) fabricated on sapphire substrates have been characterized at microwave frequencies for the first time. The highest measured room temperature electron mobility is 1380 sq cm/V-sec at a carrier density of 1.8 x 10(exp 12)/sq cm for a MODFET structure, and 900 sq cm/V-sec at a carrier density of 1.3 x 10/sq cm for a phosphorus ion implanted sample. A two finger, 2 x 200 micron gate n-MODFET has a peak transconductance of 37 mS/mm at a drain to source voltage of 2.5 V and a transducer gain of 6.4 dB at 1 GHz.

  2. Growth behavior of GaN nanowires on c-plane sapphire substrate by applying various catalysts

    NASA Astrophysics Data System (ADS)

    Kuppulingam, B.; Bhalerao, G. M.; Singh, Shubra; Baskar, K.

    2016-07-01

    Systematic reaction has been used to control the vapor-liquid-solid growth of gallium nitride nanowires (NWs) using different catalysts. GaN NWs were grown using Cu, Au, Pd/Au alloy catalysts on c-plane sapphire substrate. XRD and Raman analysis revealed the crystalline wurtzite phase of GaN synthesized at 900 °C. High density GaN NWs were studied using SEM and HRTEM. Elemental composition and impurities were analyzed by EDX. Diameter of individual NW, grown using Au catalyst is found to be ~50 nm. The diameter of NWs grown with the help of Cu catalyst was found to be ˜65 nm, whereas with Pd/Au catalyst, the diameter was about 100-200 nm. NBE emission observed from PL spectra for Cu catalyst (377 nm), Au catalyst (372 nm) as well as Pd/Au catalyst (385 nm) growth of GaN NWs respectively has been presented and discussed.

  3. High-quality single crystalline NiO with twin phases grown on sapphire substrate by metalorganic vapor phase epitaxy

    NASA Astrophysics Data System (ADS)

    Uchida, Kazuo; Yoshida, Ken-ichi; Zhang, Dongyuan; Koizumi, Atsushi; Nozaki, Shinji

    2012-12-01

    High-quality single crystalline twin phase NiO grown on sapphire substrates by metalorganic vapor phase epitaxy is reported. X-ray rocking curve analysis of NiO films grown at different temperatures indicates a minimum full width at half maximum of the cubic (111) diffraction peak of 0.107° for NiO film grown at as low as 550 °C. Detailed microstructural analysis by Φ scan X-ray diffraction and transmission electron microscopy reveal that the NiO film consists of large single crystalline domains with two different crystallographic orientations which are rotated relative to each other along the [111] axis by 60°. These single crystal domains are divided by the twin phase boundaries.

  4. Halide vapor phase epitaxy of twin-free α-Ga2O3 on sapphire (0001) substrates

    NASA Astrophysics Data System (ADS)

    Oshima, Yuichi; Víllora, Encarnación G.; Shimamura, Kiyoshi

    2015-05-01

    The halide vapor phase epitaxy of α-Ga2O3 is demonstrated for the first time. The films are twin-free and heteroepitaxially grown on sapphire (0001) substrates using gallium chloride and oxygen as precursors. X-ray ω-2θ and pole figure measurements reveal that the film is single-crystalline (0001) α-Ga2O3 with no detectable formation of β-Ga2O3. The optical bandgap is determined to be 5.16 eV based on the transmittance spectrum. The growth rate monotonically increases with the partial pressures of the raw material gases, reaching approximately 150 µm/h, which is over two orders of magnitude larger than those of conventional vapor phase epitaxial growth techniques, such as mist CVD or MBE.

  5. Influence of vicinal sapphire substrate on the properties of N-polar GaN films grown by metal-organic chemical vapor deposition

    SciTech Connect

    Lin, Zhiyu; Zhang, Jincheng Xu, Shengrui; Chen, Zhibin; Yang, Shuangyong; Tian, Kun; Hao, Yue; Su, Xujun; Shi, Xuefang

    2014-08-25

    The influence of vicinal sapphire substrates on the growth of N-polar GaN films by metal-organic chemical vapor deposition is investigated. Smooth GaN films without hexagonal surface feature are obtained on vicinal substrate. Transmission electron microscope results reveal that basal-plane stacking faults are formed in GaN on vicinal substrate, leading to a reduction in threading dislocation density. Furthermore, it has been found that there is a weaker yellow luminescence in GaN on vicinal substrate than that on (0001) substrate, which might be explained by the different trends of the carbon impurity incorporation.

  6. Impact of layer and substrate properties on the surface acoustic wave velocity in scandium doped aluminum nitride based SAW devices on sapphire

    NASA Astrophysics Data System (ADS)

    Gillinger, M.; Shaposhnikov, K.; Knobloch, T.; Schneider, M.; Kaltenbacher, M.; Schmid, U.

    2016-06-01

    This paper investigates the performance of surface acoustic wave (SAW) devices consisting of reactively sputter deposited scandium doped aluminum nitride (ScxAl1-xN) thin films as piezoelectric layers on sapphire substrates for wireless sensor or for RF-MEMS applications. To investigate the influence of piezoelectric film thickness on the device properties, samples with thickness ranging from 500 nm up to 3000 nm are fabricated. S21 measurements and simulations demonstrate that the phase velocity is predominantly influenced by the mass density of the electrode material rather than by the thickness of the piezoelectric film. Additionally, the wave propagation direction is varied by rotating the interdigital transducer structures with respect to the crystal orientation of the substrate. The phase velocity is about 2.5% higher for a-direction compared to m-direction of the sapphire substrate, which is in excellent agreement with the difference in the anisotropic Young's modulus of the substrate corresponding to these directions.

  7. Optimization of thin-film YBa/sub 2/Cu/sub 3/O/sub 7/ deposition by dc sputtering onto sapphire substrates

    SciTech Connect

    Tomlinson, E.J.; Barber, Z.H.; Morris, G.W.; Somekh, R.E.; Evetts, J.E.

    1989-03-01

    The authors report on the deposition of Yba/sub 2/Cu/sub 3/O/sub 7/ thin films onto epitaxial magnesia coated single crystal sapphire substrates at deposition temperatures in the range 600/sup 0/-850/sup 0/C. Using a UHV dc magnetron sputter deposition system with both composite metal and ceramic oxide targets, the dependence of film composition on sputtering parameters has been investigated. Films deposited onto epitaxial magnesia are compared with those deposited directly onto sapphire and yttria stabilized zirconia (YSZ).

  8. Large-scale fabrication of nanopatterned sapphire substrates by annealing of patterned Al thin films by soft UV-nanoimprint lithography

    NASA Astrophysics Data System (ADS)

    Cui, Lin; Han, Jie-Cai; Wang, Gui-Gen; Zhang, Hua-Yu; Sun, Rui; Li, Ling-Hua

    2013-11-01

    Large-scale nanopatterned sapphire substrates were fabricated by annealing of patterned Al thin films. Patterned Al thin films were obtained by soft UV-nanoimprint lithography and reactive ion etching. The soft mold with 550-nm-wide lines separated by 250-nm space was composed of the toluene-diluted polydimethylsiloxane (PDMS) layer supported by the soft PDMS. Patterned Al thin films were subsequently subjected to dual-stage annealing due to the melting temperature of Al thin films (660°C). The first comprised a low-temperature oxidation anneal at 450°C for 24 h. This was followed by a high-temperature annealing in the range of 1,000°C and 1,200°C for 1 h to induce growth of the underlying sapphire single crystal to consume the oxide layer. The SEM results indicate that the patterns were retained on sapphire substrates after high-temperature annealing at less than 1,200°C. Finally, large-scale nanopatterned sapphire substrates were successfully fabricated by annealing of patterned Al thin films for 24 h at 450°C and 1 h at 1,000°C by soft UV-nanoimprint lithography.

  9. Large-scale fabrication of nanopatterned sapphire substrates by annealing of patterned Al thin films by soft UV-nanoimprint lithography

    PubMed Central

    2013-01-01

    Large-scale nanopatterned sapphire substrates were fabricated by annealing of patterned Al thin films. Patterned Al thin films were obtained by soft UV-nanoimprint lithography and reactive ion etching. The soft mold with 550-nm-wide lines separated by 250-nm space was composed of the toluene-diluted polydimethylsiloxane (PDMS) layer supported by the soft PDMS. Patterned Al thin films were subsequently subjected to dual-stage annealing due to the melting temperature of Al thin films (660°C). The first comprised a low-temperature oxidation anneal at 450°C for 24 h. This was followed by a high-temperature annealing in the range of 1,000°C and 1,200°C for 1 h to induce growth of the underlying sapphire single crystal to consume the oxide layer. The SEM results indicate that the patterns were retained on sapphire substrates after high-temperature annealing at less than 1,200°C. Finally, large-scale nanopatterned sapphire substrates were successfully fabricated by annealing of patterned Al thin films for 24 h at 450°C and 1 h at 1,000°C by soft UV-nanoimprint lithography. PMID:24215718

  10. Temperature dependence of the crystalline quality of AlN layer grown on sapphire substrates by metalorganic chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Li, Xiao-Hang; Wei, Yong O.; Wang, Shuo; Xie, Hongen; Kao, Tsung-Ting; Satter, Md. Mahbub; Shen, Shyh-Chiang; Douglas Yoder, P.; Detchprohm, Theeradetch; Dupuis, Russell D.; Fischer, Alec M.; Ponce, Fernando A.

    2015-03-01

    We studied temperature dependence of crystalline quality of AlN layers at 1050-1250 °C with a fine increment step of around 18 °C. The AlN layers were grown on c-plane sapphire substrates by metalorganic chemical vapor deposition (MOCVD) and characterized by X-ray diffraction (XRD) ω-scans and atomic force microscopy (AFM). At 1050-1068 °C, the templates exhibited poor quality with surface pits and higher XRD (002) and (102) full-width at half-maximum (FWHM) because of insufficient Al atom mobility. At 1086 °C, the surface became smooth suggesting sufficient Al atom mobility. Above 1086 °C, the (102) FWHM and thus edge dislocation density increased with temperatures which may be attributed to the shorter growth mode transition from three-dimension (3D) to two-dimension (2D). Above 1212 °C, surface macro-steps were formed due to the longer diffusion length of Al atoms than the expected step terrace width. The edge dislocation density increased rapidly above 1212 °C, indicating this temperature may be a threshold above which the impact of the transition from 3D to 2D is more significant. The (002) FWHM and thus screw dislocation density were insensitive to the temperature change. This study suggests that high-quality AlN/sapphire templates may be potentially achieved at temperatures as low as 1086 °C which is accessible by most of the III-nitride MOCVD systems.

  11. Effect of current crowding on the ideality factor in MQW InGaN/GaN LEDs on sapphire substrates

    NASA Astrophysics Data System (ADS)

    Malyutenko, V. K.; Bolgov, S. S.

    2010-02-01

    To date, the reason for high ideality factor, β, in GaN-based LEDs grown on sapphire substrate is not fully understood and explained. It is believed that β-factor exceeding 2.0 originates from the trap-assisted tunneling and charge carrier leakage inside the active MQW LED region or is due to additional junctions available in the LED circuit. In this research, we demonstrate that β values higher than those predicted by the classical theory may be related to the current crowding effect that is difficult to avoid in LEDs grown on the insulating substrates. By analyzing theoretical model and testing commercial lateral blue LEDs with two different p-electrode pattern, we show that β -factor could increase from 2.0 (current spreading geometry) up to 3.5 (current crowding geometry). This modification of β-factor occurs in the intermediate range of current (10 μA - 10 mA, the space charge region dominates in LED performance) and therefore could be erroneously treated as the change of carrier transport mechanism and charge carrier recombination nature. At higher current (series resistance dominates) even insignificant increase of β-factor makes the current value of efficiency rollover to decrease (from 35 mA to 15 mA) and the efficiency droop to increase by 10%.

  12. Twin symmetry texture of energetically condensed niobium thin films on sapphire substrate (a-plane Al2O3)

    NASA Astrophysics Data System (ADS)

    Zhao, X.; Phillips, L.; Reece, C. E.; Seo, Kang; Krishnan, M.; Valderrama, E.

    2011-08-01

    An energetic condensation technique, cathodic arc discharge deposition, is used to grow epitaxial Niobium (Nb) thin films on a-plane sapphire (hexagonal-closed-packed Al2O3) at moderate substrate heating temperature (<400 °C). The epitaxial Nb(110)/Al2O3(1,1,-2,0) thin films reached a maximum residual resistance ratio (RRR) value 214, despite using a reactor-grade Nb cathode source whose RRR was only 30. The measurements suggest that the film's density of impurities and structural defects are lower when compared to Nb films produced by other techniques, such as magnetron sputtering, e-beam evaporation or molecular-beam-epitaxy. At lower substrate temperature, textured polycrystalline Nb thin films were created, and the films might have twin symmetry grains with {110} orientations in-plane. The texture was revealed by x-ray diffraction pole figures. The twin symmetry might be caused by a combination effect of the Nb/Al2O3 three-dimensional epitaxial relationship ("3D-Registry" Claassen's nomenclature) and the "Volmer-Weber" (Island) growth model. However, pole figures obtained by electron backscattering diffraction (EBSD) found no twin symmetry on the thin films' topmost surface (˜50 nm in depth). The EBSD pole figures showed only one Nb{110} crystal plane orientation. A possible mechanism is suggested to explain the differences between the bulk (XRD) and surface (EBSD) pole figures.

  13. Characteristics of Coplanar Waveguide on Sapphire for High Temperature Applications (25 to 400 C)

    NASA Technical Reports Server (NTRS)

    Ponchak, George E.; Jordan, Jennifer L.; Scardelletti, Maximillian; Stalker, Amy R.

    2007-01-01

    This paper presents the characteristics of coplanar waveguide transmission lines fabricated on R-plane sapphire substrates as a function of temperature across the temperature range of 25 to 400 C. Effective permittivity and attenuation are measured on a high temperature probe station. Two techniques are used to obtain the transmission line characteristics, a Thru-Reflect-Line calibration technique that yields the propagation coefficient and resonant stubs. To a first order fit of the data, the effective permittivity and the attenuation increase linearly with temperature

  14. Characteristics of Coplanar Waveguide on Sapphire for High Temperature Applications (25 to 400 degrees C)

    NASA Technical Reports Server (NTRS)

    Ponchak, George E.; Jordan, Jennifer L.; Scardelletti, Maximilian; Stalker, Amy R.

    2007-01-01

    This paper presents the characteristics of coplanar waveguide transmission lines fabricated on R-plane sapphire substrates as a function of temperature across the temperature range of 25 to 400 C. Effective permittivity and attenuation are measured on a high temperature probe station. Two techniques are used to obtain the transmission line characteristics, a Thru-Reflect-Line calibration technique that yields the propagation coefficient and resonant stubs. To a first order fit of the data, the effective permittivity and the attenuation increase linearly with temperature.

  15. A Study of Piezoelectric Field Related Strain Difference in GaN-Based Blue Light-Emitting Diodes Grown on Silicon(111) and Sapphire Substrates.

    PubMed

    Jeon, K S; Sung, J H; Lee, M W; Song, H Y; Shin, H Y; Park, W H; Jang, Y I; Kang, M G; Choi, Y H; Lee, J S; Ko, D H; Ryu, H Y

    2016-02-01

    We investigate the strain difference in InGaN/GaN multiple quantum wells of blue light-emitting diode (LED) structures grown on silicon(1 11) and c-plane sapphire substrates by comparing the strength of piezo-electric fields in MQWs. The piezo-electric fields for two LED samples grown on silicon and sapphire substrates are measured by using the reverse-bias electro-reflectance (ER) spectroscopy. The flat-band voltage is obtained by measuring the applied reverse bias voltage that induces a phase inversion in the ER spectra, which is used to calculate the strength of piezo-electric fields. The piezo-electric field is determined to be 1.36 MV/cm for the LED on silicon substrate and 1.83 MV/cm for the LED on sapphire substrate. The ER measurement results indicate that the strain-induced piezo-electric field is greatly reduced in the LED grown on silicon substrates consistent with previous strain measurement results by micro-Raman spectroscopy and high-resolution transmission electron microscopy. PMID:27433673

  16. InGaN/GaN multi-quantum well and LED growth on wafer-bonded sapphire-on-polycrystalline AlN substrates by metalorganic chemical vapor deposition.

    SciTech Connect

    Crawford, Mary Hagerott; Olson, S. M.; Banas, M.; Park, Y. -B.; Ladous, C.; Russell, Michael J.; Thaler, Gerald; Zahler, J. M.; Pinnington, T.; Koleske, Daniel David; Atwater, Harry A.

    2008-06-01

    We report growth of InGaN/GaN multi-quantum well (MQW) and LED structures on a novel composite substrate designed to eliminate the coefficient of thermal expansion (CTE) mismatch problems which impact GaN growth on bulk sapphire. To form the composite substrate, a thin sapphire layer is wafer-bonded to a polycrystalline aluminum nitride (P-AlN) support substrate. The sapphire layer provides the epitaxial template for the growth; however, the thermo-mechanical properties of the composite substrate are determined by the P-AlN. Using these substrates, thermal stresses associated with temperature changes during growth should be reduced an order of magnitude compared to films grown on bulk sapphire, based on published CTE data. In order to test the suitability of the substrates for GaN LED growth, test structures were grown by metalorganic chemical vapor deposition (MOCVD) using standard process conditions for GaN growth on sapphire. Bulk sapphire substrates were included as control samples in all growth runs. In situ reflectance monitoring was used to compare the growth dynamics for the different substrates. The material quality of the films as judged by X-ray diffraction (XRD), photoluminescence and transmission electron microscopy (TEM) was similar for the composite substrate and the sapphire control samples. Electroluminescence was obtained from the LED structure grown on a P-AlN composite substrate, with a similar peak wavelength and peak width to the control samples. XRD and Raman spectroscopy results confirm that the residual strain in GaN films grown on the composite substrates is dramatically reduced compared to growth on bulk sapphire substrates.

  17. Structural and optical properties of AgAlTe{sub 2} layers grown on sapphire substrates by closed space sublimation method

    SciTech Connect

    Uruno, A. Usui, A.; Kobayashi, M.

    2014-11-14

    AgAlTe{sub 2} layers were grown on a- and c-plane sapphire substrates using a closed space sublimation method. Grown layers were confirmed to be single phase layers of AgAlTe{sub 2} by X-ray diffraction. AgAlTe{sub 2} layers were grown to have a strong preference for the (112) orientation on both kinds of substrates. The variation in the orientation of grown layers was analyzed in detail using the X-ray diffraction pole figure measurement, which revealed that the AgAlTe{sub 2} had a preferential epitaxial relationship with the c-plane sapphire substrate. The atomic arrangement between the (112) AgAlTe{sub 2} layer and sapphire substrates was compared. It was considered that the high order of the lattice arrangement symmetry probably effectively accommodated the lattice mismatch. The optical properties of the grown layer were also evaluated by transmittance measurements. The bandgap energy was found to be around 2.3 eV, which was in agreement with the theoretical bandgap energy of AgAlTe{sub 2}.

  18. Epitaxial aluminum-doped zinc oxide thin films on sapphire. 2: Defect equilibria and electrical properties

    SciTech Connect

    Srikant, V.; Sergo, V.; Clarke, D.R.

    1995-07-01

    The electrical transport properties of epitaxial ZnO films grown on different orientations of sapphire substrates have been measured as a function of partial pressure of oxygen. After equilibration, the carrier concentration is found to change from a p{sub O{sub 2}}{sup {minus}1/4} to a p{sub O{sub 2}}{sup {minus}3/8} dependence with increasing oxygen partial pressure. The partial pressure dependence is shown to be consistent with zinc vacancies being the rate-controlling diffusive species. In addition, the carrier concentration in ZnO films grown on A-, C-, and M-plane sapphire are the same but that of R-plane sapphire is systematically lower. Electron Hall mobility measurements as a function of carrier concentration for all the substrate orientations exhibit a transition from ``single-crystal`` behavior at high carrier concentrations to ``polycrystalline`` behavior at low carrier concentrations. This behavior is attributed to the effective height of potential barriers formed at the low-angle grain boundaries in the epitaxial ZnO films. The trap density at the grain boundaries is deduced to be {approximately}7 {times} 10{sup 12}/cm{sup 2}. The electron mobility, at constant carrier concentration, varies with the substrate orientation on which the ZnO films were grown. The difference is attributed to the difference in dislocation density in the films produced as a result of lattice mismatch with the different sapphire orientations.

  19. Gold coated zinc oxide nanonecklaces as a SERS substrate.

    PubMed

    He, Lili; Shi, Jian; Sun, Xin; Lin, Mengshi; Yu, Ping; Li, Hao

    2011-04-01

    Faceted zinc oxide nanonecklace (ZnO NN) arrays were grown on r-plane sapphires along one direction (ZnO [0001] II sapphire [10-11] and ZnO (-12-10) II sapphire (01-12)) using chemical vapor deposition. After coated with 45 nm gold films and annealed at 250 degrees C for 30 seconds, the coated ZnO NNs exhibit satisfactory and stable surface enhanced Raman scattering (SERS) effects when tested with melamine and other chemicals. The limit of detection of melamine is 10(-5) mol/L and the analytical enhancement factor is 10(4), which is competitive to a commercial substrate. This study indicates that gold coated ZnO NN substrates have a great potential as SERS-active substrates in rapid detection of trace amount food contaminants such as melamine and other chemicals. PMID:21776731

  20. Gold coated zinc oxide nanonecklaces as a SERS substrate.

    PubMed

    He, Lili; Shi, Jian; Sun, Xin; Lin, Mengshi; Yu, Ping; Li, Hao

    2011-04-01

    Faceted zinc oxide nanonecklace (ZnO NN) arrays were grown on r-plane sapphires along one direction (ZnO [0001] II sapphire [10-11] and ZnO (-12-10) II sapphire (01-12)) using chemical vapor deposition. After coated with 45 nm gold films and annealed at 250 degrees C for 30 seconds, the coated ZnO NNs exhibit satisfactory and stable surface enhanced Raman scattering (SERS) effects when tested with melamine and other chemicals. The limit of detection of melamine is 10(-5) mol/L and the analytical enhancement factor is 10(4), which is competitive to a commercial substrate. This study indicates that gold coated ZnO NN substrates have a great potential as SERS-active substrates in rapid detection of trace amount food contaminants such as melamine and other chemicals.

  1. Structural and optical properties of SrCu2O2 films deposited on sapphire substrates by pulsed laser deposition

    NASA Astrophysics Data System (ADS)

    Tambunan, Octolia Togibasa; Tukiman, Hadiyawarman; Parwanta, Kadek Juliana; Jeong, Da Woon; Jung, Chang Uk; Rhee, Seuk Joo; Liu, Chunli

    2012-10-01

    We deposited SrCu2O2 (SCO) films on sapphire (Al2O3) (0 0 0 1) substrates by pulsed laser deposition. The crystallographic orientation of the SCO thin film showed clear dependence on the growth temperature. X-ray diffraction (XRD) and transmission electron microscopy (TEM) analysis showed that the film deposited at 400 °C was mainly oriented in the SCO [2 0 0] direction, whereas when the growth temperature was increased to 600 °C, the SCO film showed a dominant orientation of SCO [1 1 2]. The SCO film deposited at 500 °C was obvious polycrystalline, showing multi peaks from (2 0 0), (1 1 2), and (2 1 1) diffraction in the XRD spectrum. The SCO film deposited at 600 °C showed a band gap energy of 3.3 eV and transparency up to 80% around 500 nm. The photoluminescence (PL) spectra of the SCO films grown at 500 °C and 600 °C mainly showed blue-green emission, which was attributed to the intra-band transition of the isolated Cu+ and Cu+-Cu+ pairs according to the temperature dependent-PL analysis.

  2. Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements

    NASA Astrophysics Data System (ADS)

    Zhang, Dan; Wang, You; Gan, Yang

    2013-06-01

    A contaminant-free surface of single-crystal α-Al2O3 (or sapphire) substrates is key to the experimental studies of its surface and interfacial properties at ambient conditions. Here we critically evaluated methods reported in the literature using comprehensive surface analysis techniques including atomic force microscopy, XPS and contact angle measurements. We found that reported methods did not perform well in terms of removing both organic and particulate contaminants from the (0 0 0 1) basal surface. After thoroughly examining the cleaning effect of various chemical solutions and UV light and plasma irradiation, and based on modified RCA cleaning protocols, we proposed a new wet-cleaning method showing outstanding cleaning performance. This new reliable method will be very useful for the next-step surface chemistry study of single-crystal α-Al2O3. It was also demonstrated that AFM, due to its high spatial resolution and sensitivity as a local probe technique, was an indispensable tool for surface contamination control studies.

  3. Light extraction efficiency analysis of GaN-based light-emitting diodes with nanopatterned sapphire substrates.

    PubMed

    Pan, Jui-Wen; Tsai, Pei-Jung; Chang, Kao-Der; Chang, Yung-Yuan

    2013-03-01

    In this paper, we propose a method to analyze the light extraction efficiency (LEE) enhancement of a nanopatterned sapphire substrates (NPSS) light-emitting diode (LED) by comparing wave optics software with ray optics software. Finite-difference time-domain (FDTD) simulations represent the wave optics software and Light Tools (LTs) simulations represent the ray optics software. First, we find the trends of and an optimal solution for the LEE enhancement when the 2D-FDTD simulations are used to save on simulation time and computational memory. The rigorous coupled-wave analysis method is utilized to explain the trend we get from the 2D-FDTD algorithm. The optimal solution is then applied in 3D-FDTD and LTs simulations. The results are similar and the difference in LEE enhancement between the two simulations does not exceed 8.5% in the small LED chip area. More than 10(4) times computational memory is saved during the LTs simulation in comparison to the 3D-FDTD simulation. Moreover, LEE enhancement from the side of the LED can be obtained in the LTs simulation. An actual-size NPSS LED is simulated using the LTs. The results show a more than 307% improvement in the total LEE enhancement of the NPSS LED with the optimal solution compared to the conventional LED.

  4. Effect of initial growth on the quality of GaN on patterned sapphire substrate with ex situ physical vapor deposition AlN seed layer

    NASA Astrophysics Data System (ADS)

    Wang, Hongbo; Daigo, Yoshiaki; Seino, Takuya; Ishibashi, Sotaro; Sugiyama, Masakazu

    2016-10-01

    GaN epitaxy was explored on a cone-patterned sapphire substrate with an ex situ AlN seed layer prepared by physical vapor deposition (PVD). The effect of initial growth on the quality of the GaN epilayer was investigated using both ex situ PVD-AlN seed layers with various thicknesses and various deposition parameters such as temperature and reactor pressure in metal-organic vapor-phase epitaxy (MOVPE). It was found that the quality of GaN is insensitive to both the thickness of the ex situ PVD-AlN seed layer and the MOVPE growth conditions. A high-quality GaN film was realized, as indicated by room-temperature CL mapping (dark spot density of 1.6 × 108 cm-2), on a patterned sapphire substrate with a wide growth condition window by simply employing an ex situ PVD-AlN seed layer.

  5. GaN-based light emitting diodes on nano-hole patterned sapphire substrate prepared by three-beam laser interference lithography

    NASA Astrophysics Data System (ADS)

    Sang, Wei-hua; Lin, Lu; Wang, Long; Min, Jia-hua; Zhu, Jian-jun; Wang, Min-rui

    2016-05-01

    Nano-hole patterned sapphire substrates (NHPSSs) were successfully prepared using a low-cost and high-efficiency approach, which is the laser interference lithography (LIL) combined with reactive ion etching (RIE) and inductively coupled plasma (ICP) techniques. Gallium nitride (GaN)-based light emitting diode (LED) structure was grown on NHPSS by metal organic chemical vapor deposition (MOCVD). Photoluminescence (PL) measurement was conducted to compare the luminescence efficiency of the GaN-based LED structure grown on NHPSS (NHPSS-LED) and that on unpatterned sapphire substrates (UPSS-LED). Electroluminescence (EL) measurement shows that the output power of NHPSS-LED is 2.3 times as high as that of UPSS-LED with an injection current of 150 mA. Both PL and EL results imply that NHPSS has an advantage in improving the crystalline quality of GaN epilayer and light extraction efficiency of LEDs at the same time.

  6. Temperature dependence of the optical properties of VO2 deposited on sapphire with different orientations

    NASA Astrophysics Data System (ADS)

    Nazari, M.; Zhao, Y.; Kuryatkov, V. V.; Fan, Z. Y.; Bernussi, A. A.; Holtz, M.

    2013-01-01

    Spectroscopic ellipsometry studies are reported for vanadium dioxide grown on c-, m-, and r-plane sapphire substrates. The crystallographic orientation of the VO2 depends strongly on the substrate, producing diverse strains in the layers which affect the interband transition energies and the phase transition temperatures. These structural differences correlate with distinct variations of the optical transitions observed in the ellipsometry results. For the m- and r-plane substrates, the VO2 appears to transform abruptly from the monoclinic phase to the rutile R structure as temperature is increased. In contrast, VO2 deposited on c-plane sapphire exhibits a sluggish transformation. For the m-plane sample, the energy gap collapses over a narrow temperature range. For the c-plane case, a broad temperature range is obtained between the onset and completion of the transformation. Raman studies of the vibrational structure show that internal stresses due to expansion and contraction across the phase transitions impacts the observed phonon energies.

  7. Growth and characterization of periodically polarity-inverted ZnO structures on sapphire substrates

    SciTech Connect

    Park, Jinsub; Yao, Takafumi

    2012-10-15

    We report on the fabrication and characterization of periodically polarity inverted (PPI) ZnO heterostructures on (0 0 0 1) Al{sub 2}O{sub 3} substrates. For the periodically inverted array of ZnO polarity, CrN and Cr{sub 2}O{sub 3} polarity selection buffer layers are used for the Zn- and O-polar ZnO films, respectively. The change of polarity and period in fabricated ZnO structures is evaluated by diffraction patterns and polarity sensitive piezo-response microscopy. Finally, PPI ZnO structures with subnanometer scale period are demonstrated by using holographic lithography and regrowth techniques.

  8. Two-Step Growth of (0001) ZnO Single-Crystal Layers on (0001) Sapphire Substrates by Halide Vapor Phase Epitaxy

    NASA Astrophysics Data System (ADS)

    Masuda, Rui; Togashi, Rie; Murakami, Hisashi; Kumagai, Yoshinao; Koukitu, Akinori

    2011-12-01

    The heteroepitaxial growth of (0001) ZnO on (0001) sapphire substrates by halide vapor phase epitaxy using a two-step growth procedure was investigated. X-ray diffraction analysis revealed that single-crystal (0001) ZnO layers on (0001) sapphire substrates were grown at 400 °C. High-temperature heteroepitaxy at 1000 °C on (0001) sapphire substrates was realized by two-step growth using the ZnO layer grown at 400 °C as a buffer layer. Two-dimensional layer growth at 1000 °C was realized on buffer layers thicker than 0.4 µm. Photoluminescence (PL) measurements performed at room temperature for the ZnO layer grown on the 0.4-µm-thick buffer layer showed a significant blueshift of near-band-edge emission (NBE). A thick buffer layer of 0.8 µm was found to be necessary for a successful two-step growth without a blueshift of NBE in the PL spectra, which is caused by a large compressive stress.

  9. Pulsed modification of germanium films on silicon, sapphire, and quartz substrates: Structure and optical properties

    SciTech Connect

    Novikov, H. A.; Batalov, R. I. Bayazitov, R. M.; Faizrakhmanov, I. A.; Lyadov, N. M.; Shustov, V. A.; Galkin, K. N.; Galkin, N. G.; Chernev, I. M.; Ivlev, G. D.; Prokop’ev, S. L.; Gaiduk, P. I.

    2015-06-15

    The structural and optical properties of thin Ge films deposited onto semiconducting and insulating substrates and modified by pulsed laser radiation are studied. The films are deposited by the sputtering of a Ge target with a low-energy Xe{sup +} ion beam. Crystallization of the films is conducted by their exposure to nanosecond ruby laser radiation pulses (λ = 0.694 μm) with the energy density W = 0.2−1.4 J cm{sup −2}. During pulsed laser treatment, the irradiated area is probed with quasi-cw (quasi-continuous-wave) laser radiation (λ = 0.532 and 1.064 μm), with the reflectance recorded R(t). Experimental data on the lifetime of the Ge melt are compared with the results of calculation, and good agreement between them is demonstrated. Through the use of a number of techniques, the dependences of the composition of the films, their crystal structure, the level of strains, and the reflectance and transmittance on the conditions of deposition and annealing are established.

  10. Comparison of AlGaN p-i-n ultraviolet avalanche photodiodes grown on free-standing GaN and sapphire substrates

    NASA Astrophysics Data System (ADS)

    Kim, Jeomoh; Ji, Mi-Hee; Detchprohm, Theeradetch; Dupuis, Russell D.; Ryou, Jae-Hyun; Sood, Ashok K.; Dhar, Nibir D.; Lewis, Jay

    2015-12-01

    We compare the performance characteristics of Al0.05Ga0.95N UV avalanche photodiodes (APDs) grown on different substrates. UV-APDs grown on a free-standing GaN substrate show lower dark-current densities for all fabricated mesa sizes than similar UV-APDs grown on a GaN/sapphire template. In addition, a stable avalanche gain higher than 5 × 105 and a significant increase in the responsivity of UV-APDs grown on a free-standing GaN substrate are observed. We believe that the high crystalline quality of Al0.05Ga0.95N UV-APDs grown on a free-standing GaN substrate with low dislocation density is responsible for the observed low leakage currents, high performance characteirstics, and reliability of the devices.

  11. Demonstration of transverse-magnetic deep-ultraviolet stimulated emission from AlGaN multiple-quantum-well lasers grown on a sapphire substrate

    SciTech Connect

    Li, Xiao-Hang E-mail: dupuis@gatech.edu; Kao, Tsung-Ting; Satter, Md. Mahbub; Shen, Shyh-Chiang; Yoder, P. Douglas; Detchprohm, Theeradetch; Dupuis, Russell D. E-mail: dupuis@gatech.edu; Wei, Yong O.; Wang, Shuo; Xie, Hongen; Fischer, Alec M.; Ponce, Fernando A.

    2015-01-26

    We demonstrate transverse-magnetic (TM) dominant deep-ultraviolet (DUV) stimulated emission from photo-pumped AlGaN multiple-quantum-well lasers grown pseudomorphically on an AlN/sapphire template by means of photoluminescence at room temperature. The TM-dominant stimulated emission was observed at wavelengths of 239, 242, and 243 nm with low thresholds of 280, 250, and 290 kW/cm{sup 2}, respectively. In particular, the lasing wavelength of 239 nm is shorter compared to other reports for AlGaN lasers grown on foreign substrates including sapphire and SiC. The peak wavelength difference between the transverse-electric (TE)-polarized emission and TM-polarized emission was approximately zero for the lasers in this study, indicating the crossover of crystal-field split-off hole and heavy-hole valence bands. The rapid variation of polarization between TE- and TM-dominance versus the change in lasing wavelength from 243 to 249 nm can be attributed to a dramatic change in the TE-to-TM gain coefficient ratio for the sapphire-based DUV lasers in the vicinity of TE-TM switch.

  12. Response to Comment on '#28;Twin Symmetry Texture of Energetically Condensed 2 Niobium Thin Films on Sapphire Substrate' #29; [J. Appl. Phys. 110, 033523(2011)

    SciTech Connect

    Xin Zhao, Charles Reece, Phillips Larry, Mahadevan Krishnan, Kang Seo

    2012-07-01

    Welander commented that in our article [J. Appl. Phys. 110, 033523(2011)] , Zhao et al claim to have found a new three-dimensional (3D) relationship for niobium-on-sapphire epitaxy”. Welander might have misunderstood the purpose of our article, which was to show that energetic condensation of Nb on sapphire drives crystal growth that is quite distinct from the type of epitaxy encountered in lower energy deposition. Welander is correct about the misidentified crystal-directions in the top-view sapphire lattice (Fig.4[ref.1]). He is also correct about the misorientation of the pole figures in Fig4[ref.1]. In Fig.1 of this response, we have corrected these errors. Perhaps because of these errors, Welander misconstrued our discussion of the Nb crystal growth as claiming a new 3D registry. That was not our intention. Rather, we wished to highlight the role of energetic condensation that drives low-defect crystal growth by a combination of non-equilibrium sub-plantation that disturbs the substrate lattice and thermal annealing that annihilates defects and promotes large-grain crystal growth.

  13. Electron scattering mechanisms in GZO films grown on a-sapphire substrates by plasma-enhanced molecular beam epitaxy

    SciTech Connect

    Liu, H. Y.; Avrutin, V.; Izyumskaya, N.; Oezguer, Ue.; Morkoc, H.; Yankovich, A. B.; Kvit, A. V.; Voyles, P. M.

    2012-05-15

    We report on the mechanisms governing electron transport using a comprehensive set of ZnO layers heavily doped with Ga (GZO) grown by plasma-enhanced molecular-beam epitaxy on a-plane sapphire substrates with varying oxygen-to-metal ratios and Ga fluxes. The analyses were conducted by temperature dependent Hall measurements which were supported by microstructural investigations as well. Highly degenerate GZO layers with n > 5 x 10{sup 20} cm{sup -3} grown under metal-rich conditions (reactive oxygen-to-metal ratio <1) show relatively larger grains ({approx}20-25 nm by x-ray diffraction) with low-angle boundaries parallel to the polar c-direction. For highly conductive GZO layers, ionized-impurity scattering with almost no compensation is the dominant mechanism limiting the mobility in the temperature range from 15 to 330 K and the grain-boundary scattering governed by quantum-mechanical tunnelling is negligible. However, due to the polar nature of ZnO having high crystalline quality, polar optical phonon scattering cannot be neglected for temperatures above 150 K, because it further reduces mobility although its effect is still substantially weaker than the ionized impurity scattering even at room temperature (RT). Analysis of transport measurements and sample microstructures by x-ray diffraction and transmission electron microscopy led to a correlation between the grain sizes in these layers and mobility even for samples with a carrier concentration in the upper 10{sup 20} cm{sup -3} range. In contrast, electron transport in GZO layers grown under oxygen-rich conditions (reactive oxygen-to-metal ratio >1), which have inclined grain boundaries and relatively smaller grain sizes of 10-20 nm by x-ray diffraction, is mainly limited by compensation caused by acceptor-type point-defect complexes, presumably (Ga{sub Zn}-V{sub Zn}), and scattering on grain boundaries. The GZO layers with n <10{sup 20} cm{sup -3} grown under metal-rich conditions with reduced Ga fluxes

  14. Patterning of light-extraction nanostructures on sapphire substrates using nanoimprint and ICP etching with different masking materials.

    PubMed

    Chen, Hao; Zhang, Qi; Chou, Stephen Y

    2015-02-27

    Sapphire nanopatterning is the key solution to GaN light emitting diode (LED) light extraction. One challenge is to etch deep nanostructures with a vertical sidewall in sapphire. Here, we report a study of the effects of two masking materials (SiO2 and Cr) and different etching recipes (the reaction gas ratio, the reaction pressure and the inductive power) in a chlorine-based (BCl3 and Cl2) inductively coupled plasma (ICP) etching of deep nanopillars in sapphire, and the etching process optimization. The masking materials were patterned by nanoimprinting. We have achieved high aspect ratio sapphire nanopillar arrays with a much steeper sidewall than the previous etching methods. We discover that the SiO2 mask has much slower erosion rate than the Cr mask under the same etching condition, leading to the deep cylinder-shaped nanopillars (122 nm diameter, 200 nm pitch, 170 nm high, flat top, and a vertical sidewall of 80° angle), rather than the pyramid-shaped shallow pillars (200 nm based diameter, 52 nm height, and 42° sidewall) resulted by using Cr mask. The processes developed are scalable to large volume LED manufacturing. PMID:25648720

  15. Nitridation- and Buffer-Layer-Free Growth of [1100]-Oriented GaN Domains on m-Plane Sapphire Substrates by Using Hydride Vapor Phase Epitaxy

    NASA Astrophysics Data System (ADS)

    Seo, Yeonwoo; Lee, Sanghwa; Jue, Miyeon; Yoon, Hansub; Kim, Chinkyo

    2012-12-01

    Over a wide range of growth conditions, GaN domains were grown on bare m-plane sapphire substrates by using hydride vapor phase epitaxy (HVPE), and the relation between these growth conditions and three possible preferred crystallographic orientations ([1100], [1103], [1122]) of GaN domains was investigated. In contrast with the previous reports by other groups, our results revealed that preferentially [1100]-oriented GaN domains were grown without low-temperature nitridation or a buffer layer, and that the growth condition of preferentially [1100]-oriented GaN was insensitive to V/III ratio.

  16. Enhancing light extraction mechanisms of GaN-based light-emitting diodes through the integration of imprinting microstructures, patterned sapphire substrates, and surface roughness.

    PubMed

    Lee, Yeeu-Chang; Ni, Ching-Huai; Chen, Chih-Yeeu

    2010-11-01

    Analysis of the various light extraction efficiency enhancement mechanisms for the GaN-based light emitting diodes (LEDs) was investigated. Experiments utilized the imprinting technique to fabricate pyramid and inverted pyramid microstructures. Roughness treatment was then integrated with these imprinting structures on patterned sapphire substrate (PSS) LEDs. An approximate 33% improvement in light output power was obtained using the pyramid profile when compared with the planar LED. This was nearly 15% higher than that of the inverted pyramid profile. The roughness effect provided an approximate 5% efficiency enhancement. The total light enhanced efficiency increased to 85.9% by integrating the imprinting pyramid structure, PSS, and surface roughness.

  17. Buffer layers for high-Tc thin films on sapphire

    NASA Technical Reports Server (NTRS)

    Wu, X. D.; Foltyn, S. R.; Muenchausen, R. E.; Cooke, D. W.; Pique, A.; Kalokitis, D.; Pendrick, V.; Belohoubek, E.

    1992-01-01

    Buffer layers of various oxides including CeO2 and yttrium-stabilized zirconia (YSZ) have been deposited on R-plane sapphire. The orientation and crystallinity of the layers were optimized to promote epitaxial growth of YBa2Cu3O(7-delta) (YBCO) thin films. An ion beam channeling minimum yield of about 3 percent was obtained in the CeO2 layer on sapphire, indicating excellent crystallinity of the buffer layer. Among the buffer materials used, CeO2 was found to be the best one for YBCO thin films on R-plane sapphire. High Tc and Jc were obtained in YBCO thin films on sapphire with buffer layers. Surface resistances of the YBCO films were about 4 mOmega at 77 K and 25 GHz.

  18. Demonstration of Y1Ba2Cu3O(7-delta) and complementary metal-oxide-semiconductor device fabrication on the same sapphire substrate

    NASA Technical Reports Server (NTRS)

    Burns, M. J.; De La Houssaye, P. R.; Russell, S. D.; Garcia, G. A.; Clayton, S. R.; Ruby, W. S.; Lee, L. P.

    1993-01-01

    We report the first fabrication of active semiconductor and high-temperature superconducting devices on the same substrate. Test structures of complementary MOS transistors were fabricated on the same sapphire substrate as test structures of Y1Ba2Cu3O(7-delta) flux-flow transistors, and separately, Y1Ba2Cu3O(7-delta) superconducting quantum interference devices utilizing both biepitaxial and step-edge Josephson junctions. Both semiconductor and superconductor devices were operated at 77 K. The cofabrication of devices using these disparate yet complementary electronic technologies on the same substrate opens the door for the fabrication of true semiconductive/superconductive hybrid integrated circuits capable of exploiting the best features of each of these technologies.

  19. Sapphire substrate-induced effects in VO{sub 2} thin films grown by oxygen plasma-assisted pulsed laser deposition

    SciTech Connect

    Skuza, J. R. E-mail: apradhan@nsu.edu; Scott, D. W.; Pradhan, A. K. E-mail: apradhan@nsu.edu

    2015-11-21

    We investigate the structural and electronic properties of VO{sub 2} thin films on c-plane sapphire substrates with three different surface morphologies to control the strain at the substrate-film interface. Only non-annealed substrates with no discernible surface features (terraces) provided a suitable template for VO{sub 2} film growth with a semiconductor-metal transition (SMT), which was much lower than the bulk transition temperature. In addition to strain, oxygen vacancy concentration also affects the properties of VO{sub 2}, which can be controlled through deposition conditions. Oxygen plasma-assisted pulsed laser deposition allows favorable conditions for VO{sub 2} film growth with SMTs that can be easily tailored for device applications.

  20. Surface resistance and residual losses of Ag-doped YBa2Cu3O7 - delta thin films on sapphire

    NASA Astrophysics Data System (ADS)

    Pinto, R.; Apte, P. R.; Hegde, M. S.; Kumar, Dhananjay

    1995-04-01

    High-quality Ag-doped YBa2Cu3O7-δ thin films have been grown by laser ablation on R-plane <11¯02> sapphire without any buffer layer. Thin films have been found to be highly c-axis oriented with Tc=90 K, transition width ΔT≤1 K, and transport Jc=1.2×106 A cm-2 at 77 K in self-field conditions. The microwave surface resistance of these films measured on patterned microstrip resonators has been found to be 530 μΩ at 10 GHz at 77 K which is the lowest reported on unbuffered sapphire. Improved in-plane epitaxy and reduced reaction rate between the substrate and the film caused due to Ag in the film are believed to be responsible for this greatly improved microwave surface resistance.

  1. Comparative DC Characteristic Analysis of AlGaN/GaN HEMTs Grown on Si(111) and Sapphire Substrates by MBE

    NASA Astrophysics Data System (ADS)

    Mukhopadhyay, Partha; Bag, Ankush; Gomes, Umesh; Banerjee, Utsav; Ghosh, Saptarsi; Kabi, Sanjib; Chang, Edward Y. I.; Dabiran, Amir; Chow, Peter; Biswas, Dhrubes

    2014-04-01

    A comparative assessment of AlGaN/GaN high-electron-mobility transistors (HEMTs) grown by molecular beam epitaxy on silicon and sapphire substrates has been carried out. Large-area power GaN HEMTs with identical device dimensions were fabricated on both substrates. A thicker AlN buffer layer was used for the GaN HEMT on silicon to achieve similar quality and uniformity of GaN epitaxy for rational comparison with that grown on sapphire. Direct-current analysis and physical characterization were carried out to understand the performance of the devices. Mathematical measurement of the instability of the current-voltage ( I- V) characteristic at high applied drain bias was carried out to evaluate the performance of both devices. An improved two-dimensional (2D) analysis of the I- V characteristic was performed from a thermal perspective including appropriate scattering effects on the 2D electron gas mobility. The experimental and analytical studies were correlated to reveal the effects of temperature-sensitive scattering phenomena on the mobility as well as on the I- V characteristic at high drain bias in terms of lattice thermal heating. It is observed that the HEMT on Si has improved stability compared with sapphire due to its weaker scattering phenomena at high drain bias, associated with its thermal conductivity. Simulation of 2D thermal mapping was also carried out to distinguish the hot-spot regions of the devices. The comparable electrical performance of these devices illustrates the viability of AlGaN/GaN HEMTs on Si(111) to achieve low-cost stable devices with better thermal power handling for high-voltage applications.

  2. Effect of sputtering pressure on crystalline quality and residual stress of AlN films deposited at 823 K on nitrided sapphire substrates by pulsed DC reactive sputtering

    NASA Astrophysics Data System (ADS)

    Ohtsuka, Makoto; Takeuchi, Hiroto; Fukuyama, Hiroyuki

    2016-05-01

    Aluminum nitride (AlN) is a promising material for use in applications such as deep-ultraviolet light-emitting diodes (UV-LEDs) and surface acoustic wave (SAW) devices. In the present study, the effect of sputtering pressure on the surface morphology, crystalline quality, and residual stress of AlN films deposited at 823 K on nitrided a-plane sapphire substrates, which have high-crystalline-quality c-plane AlN thin layers, by pulsed DC reactive sputtering was investigated. The c-axis-oriented AlN films were homoepitaxially grown on nitrided sapphire substrates at sputtering pressures of 0.4–1.5 Pa. Surface damage of the AlN sputtered films increased with increasing sputtering pressure because of arcing (abnormal electrical discharge) during sputtering. The sputtering pressure affected the crystalline quality and residual stress of AlN sputtered films because of a change in the number and energy of Ar+ ions and Al sputtered atoms. The crystalline quality of AlN films was improved by deposition with lower sputtering pressure.

  3. Growth and characterization of well-aligned densely-packed rutile TiO(2) nanocrystals on sapphire substrates via metal-organic chemical vapor deposition.

    PubMed

    Chen, C A; Chen, Y M; Korotcov, A; Huang, Y S; Tsai, D S; Tiong, K K

    2008-02-20

    Well-aligned densely-packed rutile TiO(2) nanocrystals (NCs) have been grown on sapphire (SA) (100) and (012) substrates via metal-organic chemical vapor deposition (MOCVD), using titanium-tetraisopropoxide (TTIP, Ti(OC(3)H(7))(4)) as a source reagent. The surface morphology as well as structural and spectroscopic properties of the as-deposited NCs were characterized using field-emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), selected-area electron diffractometry (SAED), x-ray diffraction (XRD) and micro-Raman spectroscopy. FESEM micrographs reveal that vertically aligned NCs were grown on SA(100), whereas the NCs on the SA(012) were grown with a tilt angle of ∼33° from the normal to substrates. TEM and SAED measurements showed that the TiO(2) NCs on SA(100) with square cross section have their long axis directed along the [001] direction. The XRD results reveal TiO(2) NCs with either (002) orientation on SA(100) substrate or (101) orientation on SA(012) substrate. A strong substrate effect on the alignment of the growth of TiO(2) NCs has been demonstrated and the probable mechanism for the formation of these NCs has been discussed. PMID:21817648

  4. Growth and characterization of well-aligned densely-packed rutile TiO2 nanocrystals on sapphire substrates via metal organic chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Chen, C. A.; Chen, Y. M.; Korotcov, A.; Huang, Y. S.; Tsai, D. S.; Tiong, K. K.

    2008-02-01

    Well-aligned densely-packed rutile TiO2 nanocrystals (NCs) have been grown on sapphire (SA) (100) and (012) substrates via metal-organic chemical vapor deposition (MOCVD), using titanium-tetraisopropoxide (TTIP, Ti(OC3H7)4) as a source reagent. The surface morphology as well as structural and spectroscopic properties of the as-deposited NCs were characterized using field-emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), selected-area electron diffractometry (SAED), x-ray diffraction (XRD) and micro-Raman spectroscopy. FESEM micrographs reveal that vertically aligned NCs were grown on SA(100), whereas the NCs on the SA(012) were grown with a tilt angle of ~33° from the normal to substrates. TEM and SAED measurements showed that the TiO2 NCs on SA(100) with square cross section have their long axis directed along the [001] direction. The XRD results reveal TiO2 NCs with either (002) orientation on SA(100) substrate or (101) orientation on SA(012) substrate. A strong substrate effect on the alignment of the growth of TiO2 NCs has been demonstrated and the probable mechanism for the formation of these NCs has been discussed.

  5. Complementary analyses on the local polarity in lateral polarity-inverted GaN heterostructure on sapphire (0001) substrate

    SciTech Connect

    Katayama, Ryuji; Kuge, Yoshihiro; Onabe, Kentaro; Matsushita, Tomonori; Kondo, Takashi

    2006-12-04

    The fabrication of the lateral polarity-inverted GaN heterostructure on sapphire (0001) using a radio-frequency-plasma-enhanced molecular beam epitaxy is demonstrated. Its microscopic properties such as surface potentials, piezoelectric polarizations, and residual carrier densities were investigated by Kelvin force microscopy and micro-Raman scattering. The inversion from Ga polarity to N polarity in a specific domain and its higher crystal perfection had been unambiguously confirmed by these complementary analyses. The results were also fairly consistent with that of KOH etching, which suggests the applicability of these processes to the fabrication of photonic nanostructures.

  6. Influence of different aspect ratios on the structural and electrical properties of GaN thin films grown on nanoscale-patterned sapphire substrates

    NASA Astrophysics Data System (ADS)

    Lee, Fang-Wei; Ke, Wen-Cheng; Cheng, Chun-Hong; Liao, Bo-Wei; Chen, Wei-Kuo

    2016-07-01

    This study presents GaN thin films grown on nanoscale-patterned sapphire substrates (NPSSs) with different aspect ratios (ARs) using a homemade metal-organic chemical vapor deposition system. The anodic aluminum oxide (AAO) technique is used to prepare the dry etching mask. The cross-sectional view of the scanning electron microscope image shows that voids exist between the interface of the GaN thin film and the high-AR (i.e. ∼2) NPSS. In contrast, patterns on the low-AR (∼0.7) NPSS are filled full of GaN. The formation of voids on the high-AR NPSS is believed to be due to the enhancement of the lateral growth in the initial growth stage, and the quick-merging GaN thin film blocks the precursors from continuing to supply the bottom of the pattern. The atomic force microscopy images of GaN on bare sapphire show a layer-by-layer surface morphology, which becomes a step-flow surface morphology for GaN on a high-AR NPSS. The edge-type threading dislocation density can be reduced from 7.1 × 108 cm-2 for GaN on bare sapphire to 4.9 × 108 cm-2 for GaN on a high-AR NPSS. In addition, the carrier mobility increases from 85 cm2/Vs for GaN on bare sapphire to 199 cm2/Vs for GaN on a high-AR NPSS. However, the increased screw-type threading dislocation density for GaN on a low-AR NPSS is due to the competition of lateral growth on the flat-top patterns and vertical growth on the bottom of the patterns that causes the material quality of the GaN thin film to degenerate. Thus, the experimental results indicate that the AR of the particular patterning of a NPSS plays a crucial role in achieving GaN thin film with a high crystalline quality.

  7. Influence of strain relaxation on the relative orientation of ZnO and ZnMnO wurtzite lattice with respect to sapphire substrates

    NASA Astrophysics Data System (ADS)

    Avramenko, K. A.; Bryksa, V. P.; Petrenko, T. L.; Kladko, V. P.; Stanchu, H. V.; Belyaev, A. E.; Deparis, C.; Zuñiga-Pérez, J.; Morhain, C.

    2016-09-01

    ZnO and Zn1-x Mn x O (0≤slant x≤slant 0.07) films with 2 μm thickness were grown on (0001) sapphire substrate by molecular beam epitaxy. X-ray, electronic and optical studies show that films have a single crystalline columnar structure with unevenly distributed impurities and defects at the interfaces and boundaries of columns. ZnO and Zn1-x Mn x O films shows a high-quality hexagonal crystal structure with ZnO cells rotated by 30° relative to the sapphire substrate. We establish that the lateral coherence length obtained from x-ray analysis of Zn1-x Mn x O films is decreased from 900 nm to 400 nm at Mn variation from x = 0 to 0.07, which corresponds to variation of an average column diameter in these films. We find that in Zn1-x Mn x O films the area sizes of coherent phonon decaying are determined by the coherent areas of concentration homogeneity of Mn distributions which are much smaller then the dimensions of the columns. Modeling of ZnO/Al2O3 interface structure and properties was performed by means of first-principle density functional theory calculations. We employ an approach based on the use of large supercells (up to 460 atoms) which makes the simulation of interfaces with very large lattice mismatch possible. In this case amorphization of crystal structure in the vicinity of the interface is appears as a natural result of calculations leading to reduction of internal strains that that originate from the ZnO/Al2O3 lattice mismatch. In all cases the double ZnO layer next closest to the to interface (as well as the upper layers) maintains a nearly perfect wurtzite crystal structure. Based on calculations we propose a new model of interface microstructure which includes Zn- or O-monolayers located between conventional ZnO and Al2O3 surfaces. Adhesion energies of ZnO films to sapphire substrate were calculated for unrotated as well as for 30° rotated domains in the cases of Zn- and O-faced ZnO surfaces both with and without additional Zn- or O

  8. Influence of strain relaxation on the relative orientation of ZnO and ZnMnO wurtzite lattice with respect to sapphire substrates

    NASA Astrophysics Data System (ADS)

    Avramenko, K. A.; Bryksa, V. P.; Petrenko, T. L.; Kladko, V. P.; Stanchu, H. V.; Belyaev, A. E.; Deparis, C.; Zuñiga-Pérez, J.; Morhain, C.

    2016-09-01

    ZnO and Zn1‑x Mn x O (0≤slant x≤slant 0.07) films with 2 μm thickness were grown on (0001) sapphire substrate by molecular beam epitaxy. X-ray, electronic and optical studies show that films have a single crystalline columnar structure with unevenly distributed impurities and defects at the interfaces and boundaries of columns. ZnO and Zn1‑x Mn x O films shows a high-quality hexagonal crystal structure with ZnO cells rotated by 30° relative to the sapphire substrate. We establish that the lateral coherence length obtained from x-ray analysis of Zn1‑x Mn x O films is decreased from 900 nm to 400 nm at Mn variation from x = 0 to 0.07, which corresponds to variation of an average column diameter in these films. We find that in Zn1‑x Mn x O films the area sizes of coherent phonon decaying are determined by the coherent areas of concentration homogeneity of Mn distributions which are much smaller then the dimensions of the columns. Modeling of ZnO/Al2O3 interface structure and properties was performed by means of first-principle density functional theory calculations. We employ an approach based on the use of large supercells (up to 460 atoms) which makes the simulation of interfaces with very large lattice mismatch possible. In this case amorphization of crystal structure in the vicinity of the interface is appears as a natural result of calculations leading to reduction of internal strains that that originate from the ZnO/Al2O3 lattice mismatch. In all cases the double ZnO layer next closest to the to interface (as well as the upper layers) maintains a nearly perfect wurtzite crystal structure. Based on calculations we propose a new model of interface microstructure which includes Zn- or O-monolayers located between conventional ZnO and Al2O3 surfaces. Adhesion energies of ZnO films to sapphire substrate were calculated for unrotated as well as for 30° rotated domains in the cases of Zn- and O-faced ZnO surfaces both with and without additional Zn- or O

  9. Dispersive growth and laser-induced rippling of large-area singlelayer MoS2 nanosheets by CVD on c-plane sapphire substrate

    NASA Astrophysics Data System (ADS)

    Liu, Hongfei; Chi, Dongzhi

    2015-06-01

    Vapor-phase growth of large-area two-dimensional (2D) MoS2 nanosheets via reactions of sulfur with MoO3 precursors vaporized and transferred from powder sources onto a target substrate has been rapidly progressing. Recent studies revealed that the growth yield of high quality singlelayer (SL) MoS2 is essentially controlled by quite a few parameters including the temperature, the pressure, the amount/weight of loaded source precursors, and the cleanup of old precursors. Here, we report a dispersive growth method where a shadow mask is encapsulated on the substrate to ‘indirectly’ supply the source precursors onto the laterally advancing growth front at elevated temperatures. With this method, we have grown large-area (up to millimeters) SL-MoS2 nanosheets with a collective in-plane orientation on c-plane sapphire substrates. Regular ripples (~1 nm in height and ~50 nm in period) have been induced by laser scanning into the SL-MoS2 nanosheets. The MoS2 ripples easily initiate at the grain boundaries and extend along the atomic steps of the substrate. Such laser-induced ripple structures can be fundamental materials for studying their effects, which have been predicted to be significant but hitherto not evidenced, on the electronic, mechanical, and transport properties of SL-MoS2.

  10. SEMICONDUCTOR DEVICES: A Ku-band 3.4 W/mm power AlGaN/GaN HEMT on a sapphire substrate

    NASA Astrophysics Data System (ADS)

    Dongfang, Wang; Xiaojuan, Chen; Xinyu, Liu

    2010-02-01

    This paper describes the first domestic Ku-band power AlGaN/GaN HEMT fabricated on a sapphire substrate. The device with a gate width of 0.5 mm and a gate length of 0.35 μm has exhibited an extrinsic current gain cutoff frequency of 20 GHz and an extrinsic maximum frequency of oscillation of 75 GHz. Under VDS = 30 V, CW operating conditions at 14 GHz, the device exhibits a linear gain of 10.4 dB and a 3-dB-gain-compressed output power of 1.4 W with a power added efficiency of 41%. Under pulse operating conditions, the linear gain is 12.8 dB and the 3-dB-compressed output power is 1.7 W. The power density reaches 3.4 W/mm.

  11. A 4.69-W/mm output power density InAlN/GaN HEMT grown on sapphire substrate

    NASA Astrophysics Data System (ADS)

    Bo, Liu; Zhihong, Feng; Sen, Zhang; Shaobo, Dun; Jiayun, Yin; Jia, Li; Jingjing, Wang; Xiaowei, Zhang; Yulong, Fang; Shujun, Cai

    2011-12-01

    We report high performance InAlN/GaN HEMTs grown on sapphire substrates. The lattice-matched InAlN/GaN HEMT sample showed a high 2DEG mobility of 1210 cm2/(V·s) under a sheet density of 2.6 × 1013 cm-2. Large signal load-pull measurements for a (2 × 100 μm) × 0.25 μm device have been conducted with a drain voltage of 24 V at 10 GHz. The presented results confirm the high performances reachable by InAlN-based technology with an output power density of 4.69 W/mm, a linear gain of 11.8 dB and a peak power-added efficiency of 48%. This is the first report of high performance InAlN/GaN HEMTs in mainland China.

  12. Contact photolithography using a carbon-black embedded soft photomask and ultraviolet light emitting diodes with application on patterned sapphire substrates.

    PubMed

    Hsieh, Heng; Wu, Chun-Ying; Lee, Yung-Chun

    2016-04-18

    This paper presents a contact photolithography method for large-area ultraviolet (UV) patterning using a soft polydimethylsiloxane (PDMS) photomask and a planar light source consisting of arrayed light-emitting diodes (LEDs). With simple design and construction, the UV light source can achieve uniformly distributed UV light intensity over an area of 4" in diameter but its divergent angle is 15°. To overcome this large divergent angle, a PDMS soft mold embedded with carbon-black inserts as the UV light blocking materials is applied. It is demonstrated that, when increasing the aspect ratio of the carbon-black inserts, one can achieve excellent UV patterning results. Both experimental data and simulation results are presented. This contact photolithography system has been successfully used for manufacturing patterned sapphire substrates (PSSs) in LED industry. The advantages and potential applications of the proposed method will be addresses.

  13. A Microstructural Comparison of the Initial Growth of AIN and GaN Layers on Basal Plane Sapphire and SiC Substrates by Low Pressure Metalorganic Chemical Vapor Depositon

    NASA Technical Reports Server (NTRS)

    George, T.; Pike, W. T.; Khan, M. A.; Kuznia, J. N.; Chang-Chien, P.

    1994-01-01

    The initial growth by low pressure metalorganic chemical vapor deposition and subsequent thermal annealing of AIN and GaN epitaxial layers on SiC and sapphire substrates is examined using high resolution transmission electron microscopy and atomic force microscopy.

  14. Room temperature ferromagnetism in epitaxial Cr{sub 2}O{sub 3} thin films grown on r-sapphire

    SciTech Connect

    Punugupati, Sandhyarani Narayan, Jagdish; Hunte, Frank

    2015-05-21

    We report on the epitaxial growth and magnetic properties of Cr{sub 2}O{sub 3} thin films grown on r-sapphire substrate using pulsed laser deposition. The X-ray diffraction (XRD) (2θ and Φ) and TEM characterization confirm that the films are grown epitaxially. The r-plane (011{sup ¯}2) of Cr{sub 2}O{sub 3} grows on r-plane of sapphire. The epitaxial relations can be written as [011{sup ¯}2] Cr{sub 2}O{sub 3} ‖ [011{sup ¯}2] Al{sub 2}O{sub 3} (out-of-plane) and [1{sup ¯}1{sup ¯}20] Cr{sub 2}O{sub 3} ‖ [1{sup ¯}1{sup ¯}20] Al{sub 2}O{sub 3} (in-plane). The as-deposited films showed ferromagnetic behavior up to 400 K but ferromagnetism almost vanishes with oxygen annealing. The Raman spectroscopy data together with strain measurements using high resolution XRD indicate that ferromagnetism in r-Cr{sub 2}O{sub 3} thin films is due to the strain caused by defects, such as oxygen vacancies.

  15. Strain-dependence Of The Structure And Ferroic Properties Of Epitaxial Ni-1 (-) Ti-x(1) (-) O-y(3) Thin Films Grown On Sapphire Substrates

    SciTech Connect

    Varga, Tamas; Droubay, Timothy C.; Bowden, Mark E.; Stephens, Sean A.; Manandhar, Sandeep; Shutthanandan, V.; Colby, Robert J.; Hu, Dehong; Shelton, William A.; Chambers, Scott A.

    2015-03-01

    Polarization-induced weak ferromagnetism has been predicted a few years back in perovskite MTiO3 (M = Fe, Mn, Ni) [Fennie, Phys. Rev. Lett. 100, 167203 (2008)]. We set out to stabilize this metastable perovskite structure by growing NiTiO3 epitaxially on sapphire Al2O3 (001) substrate, and to control the polar and magnetic properties via strain. Epitaxial Ni1-xTi1-yO3 films of different Ni/Ti ratios and thicknesses were deposited on Al2O3 substrates by pulsed laser deposition at different temperatures, and characterized using several techniques. The effect of film thickness, deposition temperature, and film stoichiometry on lattice strain, film structure, and physical properties was investigated. Our structural data from x-ray diffraction, electron microscopy, and x-ray absorption spectroscopy shows that substrate-induced strain has a marked effect on the structure and crystalline quality of the films. Physical property measurements reveal a dependence of the Néel transition and lattice polarization on strain, and highlight our ability to control the ferroic properties in NiTiO3 thin films by film stoichiometry and thickness.

  16. The improvement of GaN-based LED grown on concave nano-pattern sapphire substrate with SiO2 blocking layer

    NASA Astrophysics Data System (ADS)

    Lin, Jyun-Hao; Huang, Shyh-Jer; Su, Yan-Kuin; Huang, Kai-Wen

    2015-11-01

    In contrast to convex nano-pattern sapphire substrates (NPSS), which are frequently used to fabricate high-quality nitride-based light-emitting diodes (LEDs), concave NPSS have been paid relatively less attention. In this study, a concave NPSS was fabricated, and its nitride epitaxial growth process was evaluated in a step by step manner. A SiO2 layer was used to avoid nucleation over the sidewall and bottom of the nano-patterns to reduce dislocation reformation. Traditional LED structures were grown on the NPSS layer to determine its influence on device performance. X-ray diffraction, etched pit density, inverse leakage current, and internal quantum efficiency (IQE) results showed that dislocations and non-radiative recombination centers are reduced by the NPSS constructed with a SiO2 blocking layer. An IQE twice that on a planar substrate was also achieved; such a high IQE significantly enhanced the external quantum efficiency of the resultant device. Taken together, the results demonstrate that the SiO2 blocking layer proposed in this work can enhance the performance of LEDs.

  17. Temperature dependence of the optical properties of VO2 deposited on sapphire with different orientations

    NASA Astrophysics Data System (ADS)

    Nazari, Mohammad; Zhao, Yong; Kuryatkov, Vladimir; Fan, Zhaoyang; Bernussi, Ayrton; Holtz, Mark

    2012-10-01

    Vanadium dioxide exhibits a reversible first-order metal-insulator phase transition (MIT) at temperature TMIT= 350 K. The transformation brings structural phase transition and abrupt changes in electrical conductivity and optical properties. Despite intensive studies of this material, little is understood about the optical properties and their connection with the structural properties across the phase transition. We report spectroscopic ellipsometry and Raman investigations of the optical properties of vanadium dioxide on sapphire substrates with c-, m- and r- orientations. For the m- and r-plane substrates, VO2 is strained such that the material transforms from the monoclinic M1 phase directly to the rutile R structure. In contrast, c-plane sapphire produces strains favoring transformation from M1 into monoclinic M2 material, prior to reaching the R phase. These structural differences result in distinct variations of the optical transitions observed in the ellipsometry results. While in m-plane sample the energy gap collapses over a narrow temperature range, for the c-plane case, a broad temperature range is obtained over which the energy gap is small but not fully collapsed. Raman studies show diverse phonon behavior across the phase transitions.

  18. Dispersion properties and low infrared optical losses in epitaxial AlN on sapphire substrate in the visible and infrared range

    SciTech Connect

    Soltani, A. Stolz, A.; Gerbedoen, J.-C.; Rousseau, M.; Bourzgui, N.; De Jaeger, J.-C.; Charrier, J.; Mattalah, M.; Barkad, H. A.; Mortet, V.

    2014-04-28

    Optical waveguiding properties of a thick wurtzite aluminum nitride highly [002]-textured hetero-epitaxial film on (001) basal plane of sapphire substrate are studied. The physical properties of the film are determined by X-ray diffraction, atomic force microscopy, microRaman, and photocurrent spectroscopy. The refractive index and the thermo-optic coefficients are determined by m-lines spectroscopy using the classical prism coupling technique. The optical losses of this planar waveguide are also measured in the spectral range of 450–1553 nm. The lower value of optical losses is equal to 0.7 dB/cm at 1553 nm. The optical losses due to the surface scattering are simulated showing that the contribution is the most significant at near infrared wavelength range, whereas the optical losses are due to volume scattering and material absorption in the visible range. The good physical properties and the low optical losses obtained from this planar waveguide are encouraging to achieve a wide bandgap optical guiding platform from these aluminum nitride thin films.

  19. Evaluation of AlGaN/GaN high electron mobility transistors grown on ZrTi buffer layers with sapphire substrates

    DOE PAGES

    Ren, Fan; Pearton, Stephen J.; Ahn, Shihyun; Lin, Yi -Hsuan; Machuca, Francisco; Weiss, Robert; Welsh, Alex; McCartney, Martha R.; Smith, David J.; Kravchenko, Ivan I.

    2016-09-21

    Here, AlGaN/GaN high electron mobility transistors (HEMTs) have been grown on sapphire substrates, using ZrTi buffer layers to provide in-plane lattice-matching to hexagonal GaN. X-ray diffraction (XRD) as well as cross-section transmission electron microscopy (TEM) were used to assess the quality of the HEMT structure. The XRD 2θ scans showed full-width-at-half-maximum values of 0.16°, 0.07°, and 0.08° for ZrTi alloy, GaN buffer layer, and the entire HEMT structure, respectively. TEM studies of the GaN buffer layer and the AlN/ZrTi/AlN stack showed the importance of growing thin AlN buffer layers on the ZrTi layer prior to growth of the GaN buffermore » layer. The density of threading dislocations in the GaN channel layer of the HEMT structure was estimated to be in the 108 cm–2 range. The HEMT device exhibited a saturation drain current density of 820 mA/mm, and the channel of the fabricated HEMTs could be well modulated. A cutoff frequency (fT) of 8.9 GHz and a maximum frequency of oscillation (fmax) of 17.3 GHz were achieved for HEMTs with gate dimensions of 1 × 200 μm.« less

  20. Super-aligned carbon nanotubes patterned sapphire substrate to improve quantum efficiency of InGaN/GaN light-emitting diodes.

    PubMed

    Shan, Liang; Wei, Tongbo; Sun, Yuanping; Zhang, Yonghui; Zhen, Aigong; Xiong, Zhuo; Wei, Yang; Yuan, Guodong; Wang, Junxi; Li, Jinmin

    2015-07-27

    In this paper, the high performance GaN-based light-emitting diodes (LEDs) on carbon-nanotube-patterned sapphire substrate (CNPSS) by metal-organic chemical vapor deposition (MOCVD) are demonstrated. By studying the mechanism of nucleation, we analyze the reasons of the crystal quality improvement induced by carbon nanotubes (CNTs) in different growth process. Combining with low temperatures photoluminescence (PL) measurements and two-dimensional (2D) finite difference time-domain (FDTD) simulation results, we conclude that the improvement of optical properties and electrical properties of CNPSS mainly originates from the improvement of the internal quantum efficiency (IQE) due to decreased dislocation density during nano-epitaxial growth on CNPSS. Additionally, in order to reduce the light absorption characteristics of CNTs, different time annealing under the oxygen environment is carried out to remove part of CNTs. Under 350 mA current injections, the light output power (LOP) of CNPSS-LED annealed 2 h and 10 h exhibit 11% and 6% enhancement, respectively, compared to that of the CNPSS-LED without annealing. Therefore, high temperature annealing can effectively remove parts of CNTs and further increase the LOP, while overlong annealing time has caused degradation of the quantum well resulting in the attenuation of optical power. PMID:26367696

  1. Modern trends in crystal growth and new applications of sapphire

    NASA Astrophysics Data System (ADS)

    Akselrod, Mark S.; Bruni, Frank J.

    2012-12-01

    We provide an overview of the latest market trends and modern competing methods of sapphire crystal growth and the application of sapphire wafers as LED substrates. Almost all methods of high temperature growth from the melt are suitable for sapphire production, but each of these methods has its advantages and disadvantages depending on the application and required finished product form factor. Special attention is paid to the review of defects and imperfections that allow the engineering of new active devices based on sapphire.

  2. Failure Analysis of Sapphire Refractive Secondary Concentrators

    NASA Technical Reports Server (NTRS)

    Salem, Jonathan A.; Quinn, George D.

    2009-01-01

    Failure analysis was performed on two sapphire, refractive secondary concentrators (RSC) that failed during elevated temperature testing. Both concentrators failed from machining/handling damage on the lens face. The first concentrator, which failed during testing to 1300 C, exhibited a large r-plane twin extending from the lens through much of the cone. The second concentrator, which was an attempt to reduce temperature gradients and failed during testing to 649 C, exhibited a few small twins on the lens face. The twins were not located at the origin, but represent another mode of failure that needs to be considered in the design of sapphire components. In order to estimate the fracture stress from fractographic evidence, branching constants were measured on sapphire strength specimens. The fractographic analysis indicated radial tensile stresses of 44 to 65 MPa on the lens faces near the origins. Finite element analysis indicated similar stresses for the first RSC, but lower stresses for the second RSC. Better machining and handling might have prevented the fractures, however, temperature gradients and resultant thermal stresses need to be reduced to prevent twinning.

  3. Study of Ti:sapphire laser created by PLD

    SciTech Connect

    Jelinek, M.; Lancok, J.; Jastrabik, L.; Eason, R.W.; Anderson, A.A.; Grivas, C.; Fotakis, C.; Flory, F.

    1996-12-31

    Thin films of Ti:sapphire were fabricated by KrF laser ablation on (0001) and (1102) sapphire, on (001) quartz and on fused silica substrates from crystalline Ti:sapphire targets (0.12 wt% and 0.49 wt%). Substrates were heated during the deposition at low temperatures (500 C--600 C) or at high temperatures (1,000 C--1,390 C). Films luminescence, crystallinity, fluorescence lifetime, dopants content, waveguiding and surface morphology of created Ti:sapphire films were studied. Results are presented and discussed.

  4. Temperature-modulated annealing of c-plane sapphire for long-range-ordered atomic steps

    NASA Astrophysics Data System (ADS)

    Yatsui, Takashi; Kuribara, Kazunori; Sekitani, Tsuyoshi; Someya, Takao; Yoshimoto, Mamoru

    2016-03-01

    High-quality single-crystalline sapphire is used to prepare various semiconductors because of its thermal stability. Here, we applied the tempering technique, which is well known in the production of chocolate, to prepare a sapphire substrate. Surprisingly, we successfully realised millimetre-range ordering of the atomic step of the sapphire substrate. We also obtained a sapphire atomic step with nanometre-scale uniformity in the terrace width and atomic-step height. Such sapphire substrates will find applications in the preparation of various semiconductors and devices.

  5. Atomic layer deposition of rutile and TiO2-II from TiCl4 and O3 on sapphire: Influence of substrate orientation on thin film structure

    NASA Astrophysics Data System (ADS)

    Möldre, Kristel; Aarik, Lauri; Mändar, Hugo; Niilisk, Ahti; Rammula, Raul; Tarre, Aivar; Aarik, Jaan

    2015-10-01

    Atomic layer deposition of TiO2 from TiCl4 and ozone on single crystal α-Al2O3 substrates was investigated and the possibility to control the phase composition by the substrate orientation was demonstrated. Epitaxial growth of rutile and high-pressure TiO2-II on α-Al2O3(0 0 0 1) and rutile on α-Al2O3(0 1 1¯ 2) were obtained at 400-600 °C. On α-Al2O3(0 0 0 1), the epitaxial relationships were determined to be [0 1 0]R // [2 1¯ 1¯ 0]S and [0 0 1]R // [0 1 1¯ 0]S for rutile and sapphire, and [0 0 1]II // [2 1¯ 1¯ 0]S and [0 1¯ 0]II // [0 1 1¯ 0]S for TiO2-II and sapphire. The TiO2-II concentration up to 50% was obtained in the films deposited at 425-500 °C. On α-Al2O3(0 1 1¯ 2), the epitaxial relationship of rutile was [0 1 0]R // [2 1¯ 1¯ 0]S and [0 0 1]R // [0 1 1¯ 0]S. The densities of epitaxial films reached 4.2-4.3 g/cm3 on substrates with both orientations but the epitaxial quality was markedly higher on α-Al2O3(0 0 0 1).

  6. MOCVD growth of N-polar GaN on on-axis sapphire substrate: Impact of AlN nucleation layer on GaN surface hillock density

    NASA Astrophysics Data System (ADS)

    Marini, Jonathan; Leathersich, Jeffrey; Mahaboob, Isra; Bulmer, John; Newman, Neil; (Shadi) Shahedipour-Sandvik, F.

    2016-05-01

    We report on the impact of growth conditions on surface hillock density of N-polar GaN grown on nominally on-axis (0001) sapphire substrate by metal organic chemical vapor deposition (MOCVD). Large reduction in hillock density was achieved by implementation of an optimized high temperature AlN nucleation layer and use of indium surfactant in GaN overgrowth. A reduction by more than a factor of five in hillock density from 1000 to 170 hillocks/cm-2 was achieved as a result. Crystal quality and surface morphology of the resultant GaN films were characterized by high resolution x-ray diffraction and atomic force microscopy and found to be relatively unaffected by the buffer conditions. It is also shown that the density of smaller surface features is unaffected by AlN buffer conditions.

  7. The effect of nucleation layer thickness on the structural evolution and crystal quality of bulk GaN grown by a two-step process on cone-patterned sapphire substrate

    NASA Astrophysics Data System (ADS)

    Shang, Lin; Zhai, Guangmei; Mei, Fuhong; Jia, Wei; Yu, Chunyan; Liu, Xuguang; Xu, Bingshe

    2016-05-01

    The role of nucleation layer thickness on the GaN crystal quality grown on cone-patterned sapphire substrate (PSS) was explored. The morphologies of epitaxial GaN at different growth stages were investigated by a series of growth interruption in detail. After 10- and 15-min three-dimensional growth, the nucleation sites are very important for the bulk GaN crystal quality. They have a close relationship with the nucleation layer thickness, as confirmed through the scanning electron microscope (SEM) analysis. Nucleation sites formed mainly on patterns are bad for bulk GaN crystal quality and nucleation sites formed mainly in the trenches of PSS mounds are good for bulk GaN crystal quality, as proved by X-ray diffraction analysis. Nucleation layer thickness can effectively control the nucleation sites and thus determine the crystal quality of bulk GaN.

  8. DOE SAPPHIRE PROJECT

    SciTech Connect

    Dr. Gary R. Pickrell

    2000-03-01

    Since this is the first report for this project an extensive background section follows on the theory of operation of the single crystal sapphire sensor technology which will be developed and field tested at the Wabash River Coal Gasification Facility. Requirements for the temperature sensors for implementation in the coal gasifiers has been established in conjunction with the industrial partner, Dynegy. Coal slag immersion tests indicate good corrosion resistance of the single crystal sapphire. However, a more sophisticated corrosion apparatus has been constructed in order to test the optical attenuation of a single crystal sapphire fiber immersed in the coal slag at high temperature. These results will be reported in the next period. The data to date for sapphire sensor development is promising. More extensive data on the sapphire fiber sensor development will be reported for the next period.

  9. High performance sapphire windows

    NASA Technical Reports Server (NTRS)

    Bates, Stephen C.; Liou, Larry

    1993-01-01

    High-quality, wide-aperture optical access is usually required for the advanced laser diagnostics that can now make a wide variety of non-intrusive measurements of combustion processes. Specially processed and mounted sapphire windows are proposed to provide this optical access to extreme environment. Through surface treatments and proper thermal stress design, single crystal sapphire can be a mechanically equivalent replacement for high strength steel. A prototype sapphire window and mounting system have been developed in a successful NASA SBIR Phase 1 project. A large and reliable increase in sapphire design strength (as much as 10x) has been achieved, and the initial specifications necessary for these gains have been defined. Failure testing of small windows has conclusively demonstrated the increased sapphire strength, indicating that a nearly flawless surface polish is the primary cause of strengthening, while an unusual mounting arrangement also significantly contributes to a larger effective strength. Phase 2 work will complete specification and demonstration of these windows, and will fabricate a set for use at NASA. The enhanced capabilities of these high performance sapphire windows will lead to many diagnostic capabilities not previously possible, as well as new applications for sapphire.

  10. Sapphire tube pressure vessel

    DOEpatents

    Outwater, John O.

    2000-01-01

    A pressure vessel is provided for observing corrosive fluids at high temperatures and pressures. A transparent Teflon bag contains the corrosive fluid and provides an inert barrier. The Teflon bag is placed within a sapphire tube, which forms a pressure boundary. The tube is received within a pipe including a viewing window. The combination of the Teflon bag, sapphire tube and pipe provides a strong and inert pressure vessel. In an alternative embodiment, tie rods connect together compression fittings at opposite ends of the sapphire tube.

  11. Reduced cost and improved figure of sapphire optical components

    NASA Astrophysics Data System (ADS)

    Walters, Mark; Bartlett, Kevin; Brophy, Matthew R.; DeGroote Nelson, Jessica; Medicus, Kate

    2015-10-01

    Sapphire presents many challenges to optical manufacturers due to its high hardness and anisotropic properties. Long lead times and high prices are the typical result of such challenges. The cost of even a simple 'grind and shine' process can be prohibitive. The high precision surfaces required by optical sensor applications further exacerbate the challenge of processing sapphire thereby increasing cost further. Optimax has demonstrated a production process for such windows that delivers over 50% time reduction as compared to traditional manufacturing processes for sapphire, while producing windows with less than 1/5 wave rms figure error. Optimax's sapphire production process achieves significant improvement in cost by implementation of a controlled grinding process to present the best possible surface to the polishing equipment. Following the grinding process is a polishing process taking advantage of chemical interactions between slurry and substrate to deliver excellent removal rates and surface finish. Through experiments, the mechanics of the polishing process were also optimized to produce excellent optical figure. In addition to reducing the cost of producing large sapphire sensor windows, the grinding and polishing technology Optimax has developed aids in producing spherical sapphire components to better figure quality. In addition to reducing the cost of producing large sapphire sensor windows, the grinding and polishing technology Optimax has developed aids in producing spherical sapphire components to better figure quality. Through specially developed polishing slurries, the peak-to-valley figure error of spherical sapphire parts is reduced by over 80%.

  12. Aligned epitaxial SnO2 nanowires on sapphire: growth and device applications.

    PubMed

    Wang, Xiaoli; Aroonyadet, Noppadol; Zhang, Yuzheng; Mecklenburg, Matthew; Fang, Xin; Chen, Haitian; Goo, Edward; Zhou, Chongwu

    2014-06-11

    Semiconducting SnO2 nanowires have been used to demonstrate high-quality field-effect transistors, optically transparent devices, photodetectors, and gas sensors. However, controllable assembly of rutile SnO2 nanowires is necessary for scalable and practical device applications. Here, we demonstrate aligned, planar SnO2 nanowires grown on A-plane, M-plane, and R-plane sapphire substrates. These parallel nanowires can reach 100 μm in length with sufficient density to be patterned photolithographically for field-effect transistors and sensor devices. As proof-of-concept, we show that transistors made this way can achieve on/off current ratios on the order of 10(6), mobilities around 71.68 cm(2)/V·s, and sufficiently high currents to drive external organic light-emitting diode displays. Furthermore, the aligned SnO2 nanowire devices are shown to be photosensitive to UV light with the capability to distinguish between 254 and 365 nm wavelengths. Their alignment is advantageous for polarized UV light detection; we have measured a polarization ratio of photoconductance (σ) of 0.3. Lastly, we show that the nanowires can detect NO2 at a concentration of 0.2 ppb, making them a scalable, ultrasensitive gas sensing technology. Aligned SnO2 nanowires offer a straightforward method to fabricate scalable SnO2 nanodevices for a variety of future electronic applications.

  13. Atomic-scale investigation of structural defects in GaN layer on c-plane sapphire substrate during initial growth stage

    NASA Astrophysics Data System (ADS)

    Matsubara, Tohoru; Sugimoto, Kohei; Okada, Narihito; Tadatomo, Kazuyuki

    2016-04-01

    Structural defects in the initial growth stages of GaN on sapphire, including stacking faults (SFs), threading dislocations (TDs), and mosaic structure containing grain boundaries, are investigated at the atomic scale. Individual grains in the as-deposited low temperature-GaN buffer layer are found to have twists correlated with those of the adjacent grains. These grains have little similarity on the stacking sequences, and the atomic arrangement on each side of the grain boundaries may be rearranged by annealing to achieve higher similarity in the stacking sequence. The TD identified as a-type at the top of the SFs-rich interfacial region is thought to originate from Frank partial dislocations. The Frank partial dislocation produces a distorted wurtzite-type structure. At the intermediate region of the basal-plane stacking fault between Frank and Shockley partial dislocations, the TD relieves the distortion in the wurtzite-type structure. In the TD, the wurtzite structure slips relative to the surrounding wurtzite.

  14. Damage testing of sapphire and Ti: sapphire laser materials

    NASA Technical Reports Server (NTRS)

    1999-01-01

    Diffusion bonded sapphire and Ti (Titanium). Sapphire laser materials that will be damage tested to determine if there is an increase in damage threshold. Photographed in building 1145, photographic studio.

  15. Change in equilibrium position of misfit dislocations at the GaN/sapphire interface by Si-ion implantation into sapphire. II. Electron energy loss spectroscopic study

    SciTech Connect

    Lee, Sung Bo Han, Heung Nam; Kim, Young-Min

    2015-07-15

    In Part I, we have shown that the addition of Si into sapphire by ion implantationmakes the sapphire substrate elastically softer than for the undoped sapphire. The more compliant layer of the Si-implanted sapphire substrate can absorb the misfit stress at the GaN/sapphire interface, which produces a lower threading-dislocation density in the GaN overlayer. Here in Part II, based on experimental results by electron energy loss spectroscopy and a first-principle molecular orbital calculation in the literature, we suggest that the softening effect of Si results from a reduction of ionic bonding strength in sapphire (α-Al{sub 2}O{sub 3}) with the substitution of Si for Al.

  16. Fabrication of Monolithic Sapphire Membranes for High Tc Bolometer Array Development

    NASA Technical Reports Server (NTRS)

    Pugel, D. E.; Lakew, B.; Aslam, S.; Wang, L.

    2003-01-01

    This paper examines the effectiveness of Pt/Cr thin film masks for the architecture of monolithic membrane structures in r-plane sapphire. The development of a pinhole-free Pt/Cr composite mask that is resistant to hot H2SO4:H3PO4 etchant, will lead to the fabrication of smooth sapphire membranes whose surfaces are well-suited for the growth of low-noise high Tc films. In particular, the relationship of thermal annealing conditions on the Pt/Cr composite mask system to: (1) changes in the surface morphology and elemental concentration of the Pt/Cr thin film layers and (2) etch pit formation on the sapphire surface will be presented.

  17. Fabrication of Monolithic Sapphire Membranes for High T(sub c) Bolometer Array Development

    NASA Technical Reports Server (NTRS)

    Pugel, D. E.; Lakew, B.; Aslam, S.; Wang, L.

    2004-01-01

    This paper examines the effectiveness of Pt/Cr thin film masks for the architecture of monolithic membrane structures in r-plane single crystal sapphire. The development of a pinhole-free Pt/Cr composite mask that is resistant to boiling H2SO4:H3PO4 etchant will lead to the fabrication of smooth sapphire membranes whose surfaces are well-suited for the growth of low-noise high Tc films. In particular, the relationship of thermal annealing conditions on the Pt/Cr composite mask system to: (1) changes in the surface morphology (2) elemental concentration of the Pt/Cr thin film layers and (3) etch pit formation on the sapphire surface will be presented.

  18. Characteristics of a Zn{sub 0.7}Mg{sub 0.3}O/ZnO heterostructure field-effect transistor grown on sapphire substrate by molecular-beam epitaxy

    SciTech Connect

    Koike, Kazuto; Nakashima, Ippei; Hashimoto, Kazuyuki; Sasa, Shigehiko; Inoue, Masataka; Yano, Mitsuaki

    2005-09-12

    Characterization of a Zn{sub 0.7}Mg{sub 0.3}O/ZnO heterostructure field-effect transistor (HFET) is reported. The HFET was based on a Zn{sub 0.7}Mg{sub 0.3}O/ZnO/Zn{sub 0.7}Mg{sub 0.3}O single quantum well (SQW) grown on an a-plane sapphire substrate by molecular-beam epitaxy, and was fabricated by a conventional photolithography technique combined with dry etching. Room-temperature characteristic of the HFET was a n-channel depletion type with a transconductance of 0.70 mS/mm and a field-effect mobility of 140 cm{sup 2}/V s, in good agreement with the electron Hall mobility in SQW of 130 cm{sup 2}/V s. The on/off ratio at V{sub DS}=3 V was {approx}800, which was limited by an insufficiently suppressed leakage current through the bottom Zn{sub 0.7}Mg{sub 0.3}O barrier.

  19. Influences of group-III source preflow on the polarity, optical, and structural properties of GaN grown on nitridated sapphire substrates by metal-organic chemical vapor deposition

    SciTech Connect

    Li, Chengguo; Liu, Hongfei; Chua, Soo Jin

    2015-03-28

    We report the influences of group-III source preflow, which were introduced prior to the growth of the low temperature GaN on the polarity, photoluminescence (PL), and crystallographic properties of GaN epilayers grown on nitridated c-plane sapphire substrates by metal-organic chemical vapor deposition. By studying the surface morphology evolutions under chemical etching in KOH, we found that with increasing the trimethyl-gallium (TMGa) preflow duration (t), the polarity of the GaN film can be changed from a complete N-polarity to a mixture of N- and Ga-polarity and further to a complete Ga-polarity. PL and high-resolution X-ray diffraction studies revealed that the impurity incorporation and the edge- and screw-type threading dislocations are strongly polarity dependent. A further study at the optimized t (i.e., 30 s for TMGa) shows that the polarity inversion of GaN can be realized not only by TMGa preflow but also by trimethyl-aluminium preflow and by trimethyl-indium preflow. A two-monolayer model was employed to explain the polarity inversion mechanism.

  20. Design of a back-illuminated, crystallographically etched, silicon-on-sapphire avalanche photodiode with monolithically integrated microlens, for dual-mode passive & active imaging arrays

    NASA Astrophysics Data System (ADS)

    Stern, Alvin G.; Cole, Daniel C.

    2008-12-01

    There is a growing need in space and environmental research applications for dual-mode, passive and active 2D and 3D ladar imaging methods. To fill this need, an advanced back-illuminated avalanche photodiode (APD) design is presented based on crystallographically etched (100) epitaxial silicon on R-plane sapphire (SOS), enabling single photon sensitive, solid-state focal plane arrays (FPAs) with wide dynamic range, supporting passive and active imaging capability in a single FPA. When (100) silicon is properly etched with KOH:IPA:H2O solution through a thermally grown oxide mask, square based pyramidal frustum or mesa arrays result with the four mesa sidewalls of the APD formed by (111) silicon planes that intersect the (100) planes at a crystallographic angle, Φc = 54.7°. The APD device is fabricated in the mesa using conventional silicon processing technology. Detectors are back-illuminated through light focusing microlenses fabricated in the thinned, AR-coated sapphire substrate. The APDs share a common, front-side anode contact, made locally at the base of each device mesa. A low resistance (Al) or (Cu) metal anode grid fills the space between pixels and also inhibits optical cross-talk. SOS-APD arrays are indium bump-bonded to CMOS readout ICs to produce hybrid FPAs. The quantum efficiency for the square 27 µm pixels exceeds 50% for 250 nm < λ < 400 nm and exceeds 80% for 400 nm < λ < 700 nm. The sapphire microlenses compensate detector quantum efficiency loss resulting from the mesa geometry and yield 100% sensitive-area-fill-factor arrays, limited in size only by the wafer diameter.

  1. Nanoscale Electrostructural Characterization of Compositionally Graded Al(x)Ga(1-x)N Heterostructures on GaN/Sapphire (0001) Substrate.

    PubMed

    Kuchuk, Andrian V; Lytvyn, Petro M; Li, Chen; Stanchu, Hryhorii V; Mazur, Yuriy I; Ware, Morgan E; Benamara, Mourad; Ratajczak, Renata; Dorogan, Vitaliy; Kladko, Vasyl P; Belyaev, Alexander E; Salamo, Gregory G

    2015-10-21

    We report on AlxGa1-xN heterostructures resulting from the coherent growth of a positive then a negative gradient of the Al concentration on a [0001]-oriented GaN substrate. These polarization-doped p-n junction structures were characterized at the nanoscale by a combination of averaging as well as depth-resolved experimental techniques including: cross-sectional transmission electron microscopy, high-resolution X-ray diffraction, Rutherford backscattering spectrometry, and scanning probe microscopy. We observed that a small miscut in the substrate orientation along with the accumulated strain during growth led to a change in the mosaic structure of the AlxGa1-xN film, resulting in the formation of macrosteps on the surface. Moreover, we found a lateral modulation of charge carriers on the surface which were directly correlated with these steps. Finally, using nanoscale probes of the charge density in cross sections of the samples, we have directly measured, semiquantitatively, both n- and p-type polarization doping resulting from the gradient concentration of the AlxGa1-xN layers. PMID:26431166

  2. Ion Milling of Sapphire

    NASA Technical Reports Server (NTRS)

    Gregory, Don A.

    2002-01-01

    The ion figuring system at the Marshall Space Flight Center has been successfully used for at least three previous investigations into the ion milling of metals. The research was directed toward improving the surface quality of X-ray directing optics. These studies were performed on surfaces that were already hand polished to an excellent surface quality and were intended to remove the residual unwanted figure left by those techniques. The ion milling was typically carried out on test surfaces or mandrels that were several centimeters in width and length. The good thermal conductivity of the metal samples allowed the ion beam to be directed onto the sample for an indefinite period of time. This is not true of sapphire or most electrical insulators and problems have arisen in recent attempts to ion mill thin samples of sapphire. The failure and fracture of the material was likely due to thermal stresses and the relatively low thermal conductivity of sapphire (compared to most metals), These assumed stresses actually provided the key as to how they might be monitored. A thermal gradient in the sapphire sample will induce an effective index of refraction change and because of the shape constraint and the crystal structure and simple thermal expansion, this index change will be nonuniform across the sample. In all but simple cubic crystal structures, this leads to a spatially nonuniform optical retardance induced on any polarized optical beam traversing the sample, and it is this retardance that can be monitored using standard polarimetric procedures.

  3. Recrystallization of silicon-on-sapphire structures at various amorphization-ion-beam energies

    SciTech Connect

    Alexandrov, P. A. Demakov, K. D.; Shemardov, S. G.; Kuznetsov, Yu. Yu.

    2013-02-15

    Silicon films on sapphire substrates are grown via recrystallization from the silicon-sapphire interface. An amorphous layer is formed using ion implantation with silicon ion energies of 90-150 keV. An X-ray rocking curve is used to estimate the crystalline perfection of the silicon films. After recrystallization, the silicon layer consists of two parts with different crystalline quality. The recrystallized silicon-on-sapphire structures have a highly perfect upper layer (for fabricating microelectronic devices) and a lower layer adjacent to the sapphire substrate containing a large number of defects.

  4. Orientation of FePt nanoparticles on top of a-SiO2/Si(001), MgO(001) and sapphire(0001): effect of thermal treatments and influence of substrate and particle size

    PubMed Central

    Schilling, Martin; Ziemann, Paul; Zhang, Zaoli; Biskupek, Johannes; Kaiser, Ute

    2016-01-01

    Summary Texture formation and epitaxy of thin metal films and oriented growth of nanoparticles (NPs) on single crystal supports are of general interest for improved physical and chemical properties especially of anisotropic materials. In the case of FePt, the main focus lies on its highly anisotropic magnetic behavior and its catalytic activity, both due to the chemically ordered face-centered tetragonal (fct) L10 phase. If the c-axis of the tetragonal system can be aligned normal to the substrate plane, perpendicular magnetic recording could be achieved. Here, we study the orientation of FePt NPs and films on a-SiO2/Si(001), i.e., Si(001) with an amorphous (a-) native oxide layer on top, on MgO(001), and on sapphire(0001) substrates. For the NPs of an approximately equiatomic composition, two different sizes were chosen: “small” NPs with diameters in the range of 2–3 nm and “large” ones in the range of 5–8 nm. The 3 nm thick FePt films, deposited by pulsed laser deposition (PLD), served as reference samples. The structural properties were probed in situ, particularly texture formation and epitaxy of the specimens by reflection high-energy electron diffraction (RHEED) and, in case of 3 nm nanoparticles, additionally by high-resolution transmission electron microscopy (HRTEM) after different annealing steps between 200 and 650 °C. The L10 phase is obtained at annealing temperatures above 550 °C for films and 600 °C for nanoparticles in accordance with previous reports. On the amorphous surface of a-SiO2/Si substrates we find no preferential orientation neither for FePt films nor nanoparticles even after annealing at 630 °C. On sapphire(0001) supports, however, FePt nanoparticles exhibit a clearly preferred (111) orientation even in the as-prepared state, which can be slightly improved by annealing at 600–650 °C. This improvement depends on the size of NPs: Only the smaller NPs approach a fully developed (111) orientation. On top of MgO(001) the

  5. (abstract) Transmission Electron Microscopy of Al(sub x)Ga(sub 1-x)N/SiC Multilayer Structures Grown on Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Pike, W. T.; George, T.; Khan, M. A.; Kuznia, J. N.

    1994-01-01

    The potential of wide-band-gap III-V nitrides as ultraviolet sensors and light emitters has prompted an increasing amount of work recently, including the fabrication of the first UV sensors from as-deposited single crystal GaN. We have used high resolution transmission electron microscopy (TEM) to study the microstructure of two novel developments of wide-band-gap III-V nitrides: the growth of ultra-short period GaN/AlN superlattices; and the incorporation of SiC layers into Al(sub x)Ga(sub 1-x)N structures. By varying the relative periods in a GaN/AlN superlattice, the band gap of the composite can be tailored to lie between the elemental values of 365 nm for GaN and 200 nm for AlN. The group IV semiconductor, SiC, has a wide band-gap and has a close lattice match (less than 3 %) to Al(sub x)Ga(sub 1-x)N for growth on the basal plane. Demonstration of epitaxial growth for Al(sub x)Ga(sub 1-x)N/SiC multilayers would introduce a wide band-gap analog to the already existing family of III-V and Si(sub 1-x)Ge(sub x) heteroepitaxial growth systems. Although good quality growth of GaN on SiC substrates has been demonstrated, Al(sub x)Ga(sub 1-x)N/SiC multilayer structures have never been grown and the interfacial structure is unknown.

  6. Design of a silicon avalanche photodiode pixel with integrated laser diode using back-illuminated crystallographically etched silicon-on-sapphire with monolithically integrated microlens for dual-mode passive and active imaging arrays

    NASA Astrophysics Data System (ADS)

    Stern, Alvin G.

    2010-08-01

    There is a growing need in scientific research applications for dual-mode, passive and active 2D and 3D LADAR imaging methods. To fill this need, an advanced back-illuminated silicon avalanche photodiode (APD) design is presented using a novel silicon-on-sapphire substrate incorporating a crystalline aluminum nitride (AlN) antireflective layer between the silicon and R-plane sapphire. This allows integration of a high quantum efficiency silicon APD with a gallium nitride (GaN) laser diode in each pixel. The pixel design enables single photon sensitive, solid-state focal plane arrays (FPAs) with wide dynamic range, supporting passive and active imaging capability in a single FPA. When (100) silicon is properly etched with TMAH solution, square based pyramidal frustum or mesa arrays result with the four mesa sidewalls of the APD formed by (111) silicon planes that intersect the (100) planes at a crystallographic angle, φ c = 54.7°. The APD device is fabricated in the mesa using conventional silicon processing technology. The GaN laser diode is fabricated by epitaxial growth inside of an inverted, etched cavity in the silicon mesa. Microlenses are fabricated in the thinned, and AR-coated sapphire substrate. The APDs share a common, front-side anode contact, and laser diodes share a common cathode. A low resistance (Al) or (Cu) metal anode grid fills the space between pixels and also inhibits optical crosstalk. SOS-APD arrays are flip-chip bump-bonded to CMOS readout ICs to produce hybrid FPAs. The square 27 μm emitter-detector pixel achieves SNR > 1 in active detection mode for Lambert surfaces at 1,000 meters.

  7. Ion Milling of Sapphire

    NASA Technical Reports Server (NTRS)

    Gregory, Don A.; Herren, Kenneth A.

    2004-01-01

    The ion milling of sapphire is a complicated operation due to several characteristics of the material itself. It is a relatively hard transparent nonconductive crystalline material that does not transfer heat nearly as well as metals that have been successfully ion milled in the past. This investigation involved designing an experimental arrangement, using existing ion milling equipment, as the precursor to figuring the surface of sapphire and other insulating optical materials. The experimental arrangement employs a laser probe beam to constantly monitor the stresses being induced in the material, as it is being ion milled. The goal is to determine if the technique proposed would indeed indicate the stress being induced in the material so that these stresses can be managed to prevent failure of the optic.

  8. Slow Crack Growth and Fracture Toughness of Sapphire for the International Space Station Fluids and Combustion Facility

    NASA Technical Reports Server (NTRS)

    Salem, Jonathan A.

    2006-01-01

    The fracture toughness, inert flexural strength, and slow crack growth parameters of the r- and a-planes of sapphire grown by the Heat Exchange Method were measured to qualify sapphire for structural use in the International Space Station. The fracture toughness in dry nitrogen, K(sub Ipb), was 2.31 +/- 0.12 MPa(square root of)m and 2.47 +/- 0.15 MPa(squre root of)m for the a- and r-planes, respectively. Fracture toughness measured in water via the operational procedure in ASTM C1421 was significantly lower, K(sub Ivb) = 1.95+/- 0.03 MPa(square root of)m, 1.94 +/- 0.07 and 1.77 +/- 0.13 MPa(square root of)m for the a- , m- and r-planes, respectively. The mean inert flexural strength in dry nitrogen was 1085 +/- 127 MPa for the r-plane and 1255 +/- 547 MPa for the a-plane. The power law slow crack growth exponent for testing in water was n = 21 +/- 4 for the r-plane and n (greater than or equal to) 31 for the a-plane. The power law slow crack growth coefficient was A = 2.81 x 10(exp -14) m/s x (MPa(squre root of)m)/n for the r-plane and A (approx. equals)2.06 x 10(exp -15) m/s x (MPa(square root of)m)/n for the a-plane. The r- and a-planes of sapphire are relatively susceptible to stress corrosion induced slow crack growth in water. However, failure occurs by competing modes of slow crack growth at long failure times and twinning for short failure time and inert environments. Slow crack growth testing needs to be performed at low failure stress levels and long failure times so that twinning does not affect the results. Some difficulty was encountered in measuring the slow crack growth parameters for the a-plane due to a short finish (i.e., insufficient material removal for elimination of the damage generated in the early grinding stages). A consistent preparation method that increases the Weibull modulus of sapphire test specimens and components is needed. This would impart higher component reliability, even if higher Weibull modulus is gained at the sacrifice of

  9. Growth of crystalline ZnO films on the nitridated (0001) sapphire surface

    SciTech Connect

    Butashin, A. V.; Kanevsky, V. M.; Muslimov, A. E. Prosekov, P. A.; Kondratev, O. A.; Blagov, A. E.; Vasil’ev, A. L.; Rakova, E. V.; Babaev, V. A.; Ismailov, A. M.; Vovk, E. A.; Nizhankovsky, S. V.

    2015-07-15

    The surface morphology and structure of (0001) sapphire substrates subjected to thermochemical nitridation in a mixture of N{sub 2}, CO, and H{sub 2} gases are investigated by electron and probe microscopy and X-ray and electron diffraction. It is shown that an aluminum nitride layer is formed on the substrate surface and heteroepitaxial ZnO films deposited onto such substrates by magnetron sputtering have a higher quality when compared with films grown on sapphire.

  10. Optical absorption edge of ZnO thin films: The effect of substrate

    SciTech Connect

    Srikant, V.; Clarke, D.R.

    1997-05-01

    The optical absorption edge and the near-absorption edge characteristics of undoped ZnO films grown by laser ablation on various substrates have been investigated. The band edge of films on C [(0001)] and R-plane [(1102)] sapphire, 3.29 and 3.32 eV, respectively, are found to be very close to the single crystal value of ZnO (3.3 eV) with the differences being accounted for in terms of the thermal mismatch strain using the known deformation potentials of ZnO. In contrast, films grown on fused silica consistently exhibit a band edge {approximately}0.1eV lower than that predicted using the known deformation potential and the thermal mismatch strains. This behavior is attributed to the small grain size (50 nm) realized in these films and the effect of electrostatic potentials that exist at the grain boundaries. Additionally, the spread in the tail (E{sub 0}) of the band edge for the different films is found to be very sensitive to the defect structure in the films. For films grown on sapphire substrates, values of E{sub 0} as low as 30 meV can be achieved on annealing in air, whereas films on fused silica always show a value {gt}100meV. We attribute this difference to the substantially higher density of high-angle grain boundaries in the films on fused silica. {copyright} {ital 1997 American Institute of Physics.}

  11. Spatially resolved and orientation dependent Raman mapping of epitaxial lateral overgrowth nonpolar a-plane GaN on r-plane sapphire

    PubMed Central

    Jiang, Teng; Xu, Sheng-rui; Zhang, Jin-cheng; Xie, Yong; Hao, Yue

    2016-01-01

    Uncoalesced a-plane GaN epitaxial lateral overgrowth (ELO) structures have been synthesized along two mask stripe orientations on a-plane GaN template by MOCVD. The morphology of two ELO GaN structures is performed by Scanning electronic microscopy. The anisotropy of crystalline quality and stress are investigated by micro-Raman spectroscopy. According to the Raman mapping spectra, the variations on the intensity, peak shift and the full width at half maximum (FWHM) of GaN E2 (high) peak indicate that the crystalline quality improvement occurs in the window region of the GaN stripes along [0001], which is caused by the dislocations bending towards the sidewalls. Conversely, the wing regions have better quality with less stress as the dislocations propagated upwards when the GaN stripes are along []. Spatial cathodoluminescence mapping results further support the explanation for the different dislocation growth mechanisms in the ELO processes with two different mask stripe orientations. PMID:26821824

  12. Spatially resolved and orientation dependent Raman mapping of epitaxial lateral overgrowth nonpolar a-plane GaN on r-plane sapphire.

    PubMed

    Jiang, Teng; Xu, Sheng-Rui; Zhang, Jin-Cheng; Xie, Yong; Hao, Yue

    2016-01-29

    Uncoalesced a-plane GaN epitaxial lateral overgrowth (ELO) structures have been synthesized along two mask stripe orientations on a-plane GaN template by MOCVD. The morphology of two ELO GaN structures is performed by Scanning electronic microscopy. The anisotropy of crystalline quality and stress are investigated by micro-Raman spectroscopy. According to the Raman mapping spectra, the variations on the intensity, peak shift and the full width at half maximum (FWHM) of GaN E2 (high) peak indicate that the crystalline quality improvement occurs in the window region of the GaN stripes along [0001], which is caused by the dislocations bending towards the sidewalls. Conversely, the wing regions have better quality with less stress as the dislocations propagated upwards when the GaN stripes are along []. Spatial cathodoluminescence mapping results further support the explanation for the different dislocation growth mechanisms in the ELO processes with two different mask stripe orientations.

  13. Temperature behaviour of strain and defects in sapphire implanted with Si+ ions

    NASA Astrophysics Data System (ADS)

    Flynn, C.; Atanackovic, P.; Enjeti, L.

    2012-08-01

    Strain and defects produced by implantation of Si+ ions into r-plane sapphire are studied by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Post-implantation annealing carried out at temperatures up to 1100 °C is observed to reduce strain and the number of defects. The peak value of strain falls linearly with increasing annealing temperature. Peaks in the strain depth profiles correspond to the regions of highest defect density. Roughness and amorphous content at the surface can be reduced by high temperature annealing.

  14. Polar and Nonpolar Gallium Nitride and Zinc Oxide based thin film heterostructures Integrated with Sapphire and Silicon

    NASA Astrophysics Data System (ADS)

    Gupta, Pranav

    This dissertation work explores the understanding of the relaxation and integration of polar and non-polar of GaN and ZnO thin films with Sapphire and silicon substrates. Strain management and epitaxial analysis has been performed on wurtzitic GaN(0001) thin films grown on c-Sapphire and wurtzitic non-polar a-plane GaN(11-20) thin films grown on r-plane Sapphire (10-12) by remote plasma atomic nitrogen source assisted UHV Pulsed Laser Deposition process. It has been established that high-quality 2-dimensional c-axis GaN(0001) nucleation layers can be grown on c-Sapphire by PLD process at growth temperatures as low as ˜650°C. Whereas the c-axis GaN on c-sapphire has biaxially negative misfit, the crystalline anisotropy of the a-plane GaN films on r-Sapphire results in compressive and tensile misfits in the two major orthogonal directions. The measured strains have been analyzed in detail by X-ray, Raman spectroscopy and TEM. Strain relaxation in GaN(0001)/Sapphire thin film heterostructure has been explained by the principle of domain matched epitaxial growth in large planar misfit system and has been demonstrated by TEM study. An attempt has been made to qualitatively understand the minimization of free energy of the system from the strain perspective. Analysis has been presented to quantify the strain components responsible for the compressive strain observed in the GaN(0001) thin films on c-axis Sapphire substrates. It was also observed that gallium rich deposition conditions in PLD process lead to smoother nucleation layers because of higher ad-atom mobility of gallium. We demonstrate near strain relaxed epitaxial (0001) GaN thin films grown on (111) Si substrates using TiN as intermediate buffer layer by remote nitrogen plasma assisted UHV pulsed laser deposition (PLD). Because of large misfits between the TiN/GaN and TiN/Si systems the TIN buffer layer growth occurs via nucleation of interfacial dislocations under domain matching epitaxy paradigm. X-ray and

  15. Sapphire shaped crystals for medicine

    NASA Astrophysics Data System (ADS)

    Shikunova, A.; Kurlov, V. N.

    2016-01-01

    The favorable combination of excellent optical and mechanical properties of sapphire makes it an attractive structural material for medicine. We have developed a new kind of medical instruments and devices for laser photodynamic and thermal therapy, laser surgery, fluorescent diagnostics, and cryosurgery based on sapphire crystals of various shapes with capillary channels in their volume.

  16. High T(sub c) Superconducting Bolometer on Chemically Etched 7 Micrometer Thick Sapphire

    NASA Technical Reports Server (NTRS)

    Lakew, B.; Brasunas, J. C.; Pique, A.; Fettig, R.; Mott, B.; Babu, S.; Cushman, G. M.

    1997-01-01

    A transition-edge IR detector, using a YBa2Cu3O(7-x) (YBCO) thin film deposited on a chemically etched, 7 micrometer thick sapphire substrate has been built. To our knowledge it is the first such high T(sub c) superconducting (HTS) bolometer on chemically thinned sapphire. The peak optical detectivity obtained is l.2 x 10(exp 10) cmHz(sup 1/2)/W near 4Hz. Result shows that it is possible to obtain high detectivity with thin films on etched sapphire with no processing after the deposition of the YBCO film. We discuss the etching process and its potential for micro-machining sapphire and fabricating 2-dimensional detector arrays with suspended sapphire membranes. A 30 micrometer thick layer of gold black provided IR absorption. Comparison is made with the current state of the art on silicon substrates.

  17. Anisotropic Thermoelectric Properties of MnSiγ Film Prepared on R-Sapphire

    NASA Astrophysics Data System (ADS)

    Takeda, Komei; Kikuchi, Yuta; Hayashi, Kei; Miyazaki, Yuzuru; Kajitani, Tsuyoshi

    2012-05-01

    We attempted to obtain an epitaxial MnSiγ (γ˜1.7) film on R-sapphire, i.e., Sapphire(1102), substrate by pulsed laser deposition. We prepared MnSiγ films by changing the substrate temperature gradient. It was found that the MnSiγ film, whose temperature gradient in a substrate is parallel to Sapphire[1120], could be grown epitaxially on the substrate. The epitaxial relationship was MnSiγ(1000)[0010] ∥ Sapphire(1102)[1120]. The thermoelectric properties of the epitaxial MnSiγ film were different in the a- and c-axes, reflecting the anisotropic MnSiγ crystal structure. The anisotropic thermoelectric properties are discussed in terms of the electronic structure.

  18. Integrated diamond sapphire laser

    NASA Astrophysics Data System (ADS)

    Fork, Richard L.; Walker, Wesley W.; Laycock, Rustin L.; Green, Jason J. A.; Cole, Spencer T.

    2003-10-01

    We use analytic expressions and simulations to examine a model laser gain element formed by integrating diamond and a solid state laser material, such as, Ti:sapphire. The gain element is designed to provide in a single composite structure the thermal management capabilities of diamond and the optical amplification of the laser material. The model results indicate low temperature and a specific radial dependence of the heat transfer coefficient at the material interfaces are needed to access the highest average powers and highest quality optical fields. We outline paths designed to increase average output power of a lowest order mode laser oscillator based on these gain elements to megawatt levels. The long term goal is economically viable solar power delivered safely from space. The short term goal is a design strategy that will facilitate "proof of principle" demonstrations using currently accessible optical pump and thermal management capabilities.

  19. Microstructure of spinel islands on the sapphire surface grown by ion implantation and annealing.

    PubMed

    Wang, Y; Liu, X P; Qin, G W

    2014-09-01

    Fe ions were implanted into α-Al2O3 single crystals (sapphire) at energy of 50 keV and annealed in an oxidizing environment. Transmission electron microscopy (TEM) investigation indicated that Fe ions in the near surface region precipitated as α-Fe2O3 islands and spinel islands on the specimen surface, at the same time, Fe ions in the region away from the surface precipitated as α-Fe particles in the interior region of specimen. Two orientation relationships (ORs) between the spinel islands and sapphire substrate were discovered as follows: (111)spinel∥(0001)sapphire, [1 1 2¯]spinel∥[1 1 2¯ 0]sapphire and (1 1 2¯)spinel∥(0 0 0 1)sapphire, [1 1 1]spinel∥[1 1 2¯ 0]sapphire. The first OR was frequently observed in the spinel/sapphire system, however, the second OR has never been reported before. The interfaces between the spinel islands and sapphire substrate are a type-3 incoherent interface (i.e. low-index OR in at least one direction with an ill-matched low-index habit planes). The formation of spinel islands on the specimen surface can be attributed to the oxidizing atmosphere and the low accelerating voltage for ion implantation.

  20. Sapphire surface preparation and gallium nitride nucleation by hydride vapor phase epitaxy

    NASA Astrophysics Data System (ADS)

    Dwikusuma, Fransiska

    The nucleation and initial growth of gallium nitride (GaN) films on sapphire substrates using hydride vapor phase epitaxy (HVPE) technique depends on many factors including the chemical treatment of sapphire surface, nitridation, and the specific growth conditions. Liquid and gas phase treatments of the sapphire surface were systematically studied as a function of temperature and time. Phosphoric acid (H3PO4) etches sapphire preferentially at defect sites and resulted in pits formation on the surface, while etching in sulfuric acid (H2SO4) can produce a smooth, pit-free surface. Air-annealing the sapphire at 1400°C produces an atomically smooth surface consisting of a terrace-and-step structure. The mechanism of sapphire nitridation within the HVPE environment was elucidated. During nitridation, nitrogen is incorporated into the sapphire surface. The sapphire nitridation mechanism can be modeled as a diffusion couple of aluminum nitride (AlN) and aluminum oxide (Al2O 3), where N3- and O2- inter-diffuse in the 'rigid' Al3+ framework. Nitrogen diffuses into sapphire and substitutes for oxygen to bond with aluminum. The replaced oxygen diffuses out to the surface. The overall nitridation rate is controlled by the diffusion of oxygen. Sapphire surface treatments of air-annealing and liquid-based etchings have different effects on nitridation and HVPE GaN nucleation. Upon nitridation, the air-annealed sapphire has ˜1.5 times higher nitrogen content compared to liquid-based etchings. Nevertheless, the air-annealed sapphire yields the lowest density of GaN islands. Sapphire nitridation, which yields a thin AlN layer, results in the growth of higher GaN island densities with a smaller mosaic spread. Sapphire surface, which is etched in H2SO4 and then nitridated, produces a high density GaN islands resulting in improved-quality of thick GaN films. The nucleation and initial growth kinetics of GaN on sapphire grown by HVPE were investigated. As the growth temperature

  1. Miniature Sapphire Acoustic Resonator - MSAR

    NASA Technical Reports Server (NTRS)

    Wang, Rabi T.; Tjoelker, Robert L.

    2011-01-01

    A room temperature sapphire acoustics resonator incorporated into an oscillator represents a possible opportunity to improve on quartz ultrastable oscillator (USO) performance, which has been a staple for NASA missions since the inception of spaceflight. Where quartz technology is very mature and shows a performance improvement of perhaps 1 dB/decade, these sapphire acoustic resonators when integrated with matured quartz electronics could achieve a frequency stability improvement of 10 dB or more. As quartz oscillators are an essential element of nearly all types of frequency standards and reference systems, the success of MSAR would advance the development of frequency standards and systems for both groundbased and flight-based projects. Current quartz oscillator technology is limited by quartz mechanical Q. With a possible improvement of more than x 10 Q with sapphire acoustic modes, the stability limit of current quartz oscillators may be improved tenfold, to 10(exp -14) at 1 second. The electromagnetic modes of sapphire that were previously developed at JPL require cryogenic temperatures to achieve the high Q levels needed to achieve this stability level. However sapphire fs acoustic modes, which have not been used before in a high-stability oscillator, indicate the required Q values (as high as Q = 10(exp 8)) may be achieved at room temperature in the kHz range. Even though sapphire is not piezoelectric, such a high Q should allow electrostatic excitation of the acoustic modes with a combination of DC and AC voltages across a small sapphire disk (approximately equal to l mm thick). The first evaluations under this task will test predictions of an estimated input impedance of 10 kilohms at Q = 10(exp 8), and explore the Q values that can be realized in a smaller resonator, which has not been previously tested for acoustic modes. This initial Q measurement and excitation demonstration can be viewed similar to a transducer converting electrical energy to

  2. Optical properties of ultra-thin (< 30 nm) GaN layers on c-sapphire substrates with different initial growth conditions measured by surface-plasmon enhanced Raman scattering.

    PubMed

    Kim, Ho-Jong; Kim, Tae-Soo; Lee, Jin-Gyu; Song, Jung Hoon

    2014-11-01

    We have carried out surface-plasmon enhanced Raman spectroscopy (SERS) on 30 nm-thick GaN samples grown at various temperatures, in order to investigate the properties of ultra thin GaN films on sapphire. We found that the properties, such as the strain and the free-carrier density of the thin layers, were sensitively affected by the growth temperatures. Our results show that SERS, by selectively enhancing the Raman signal near the surface, can be a very useful technique to investigate the optical properties of ultra-thin GaN films and their initial growth mode.

  3. LASE Ti: Sapphire Laser

    NASA Technical Reports Server (NTRS)

    1995-01-01

    In the photo, Messrs. Leroy F. Matthews (left) and Frank J. Novak (Lockheed Engineering & Sciences Co.) are preparing the Lidar Atmospheric Sensing Experiment (LASE) Instrument for integration into a NASA/ER-2 aircraft for a field mission. LASE is the first fully- engineered, autonomous differential Absorption Lidar (DIAL) System for the measurement of water vapor, aerosol and cloud in the troposphere. LASE uses a double-pulsed Ti:Sapphire laser for the transmitter with a 30 ns pulse length and 150 mJ/pulse. The laser beam is seeded to operate on a selected water vapor absorption line in the 815-nm region using a laser diode and an onboard absorption reference cell. A 40 cm diameter telescope collects the backscattered signals and directs them onto two detectors. LASE collects DIAL data at 5 Hz while flying at altitudes from 16-21 km. LASE was designed to operate autonomously within the environment and physical constraints of the ER-2 aircraft and to make water vapor profile measurements across the troposphere with accuracy having less than 6% of error. No other instrument can provide the spatial coverage and accuracy of LASE. Water vapor is the most radiative active gas in the troposphere, and the lack of understanding about its distribution provides one of the largest uncertainties in modeling climate change. LASE has demonstrated the necessary potential in providing high resolution water vapor measurements that can advance the studies of tropospheric water vapor distributions. LASE has flown 19 times during the development of the instrument and the validation of the science data. A joint international field mission was completed in the summer of 1996; adding 9 more successful flights. The LASE Instrument is being adapted to other aircraft platforms to support planned missions and to increase its utility.

  4. LASE Ti: Sapphire Laser

    NASA Technical Reports Server (NTRS)

    1995-01-01

    In the photo, Mr. Leroy F. Matthews (Lockheed Engineering & Sciences Co.) is connecting the Thermal Control Unit cables in preparing the Lidar Atmospheric Sensing Experiment (LASE) Instrument for integration into a NASA/ER-2 aircraft for a field mission. LASE is the first fully-engineered, autonomous differential Absorption Lidar (DIAL) System for the measurement of water vapor, aerosol and cloud in the troposphere. LASE uses a double-pulsed Ti:Sapphire laser for the transmitter with a 30 ns pulse length and 150 mJ/pulse. The laser beam is seeded to operate on a selected water vapor absorption line in the 815-nm region using a laser diode and an onboard absorption reference cell. A 40 cm diameter telescope collects the backscattered signals and directs them onto two detectors. LASE collects DIAL data at 5 Hz while flying at altitudes from 16-21 km. LASE was designed to operate autonomously within the environment and physical constraints of the ER-2 aircraft and to make water vapor profile measurements across the troposphere with accuracy having less than 6% of error. No other instrument can provide the spatial coverage and accuracy of LASE. Water vapor is the most radiative active gas in the troposphere, and the lack of understanding about its distribution provides one of the largest uncertainties in modeling climate change. LASE has demonstrated the necessary potential in providing high resolution water vapor measurements that can advance the studies of tropospheric water vapor distributions. LASE has flown 19 times during the development of the instrument and the validation of the science data. A joint international field mission was completed in the summer of 1996; adding 9 more successful flights. The LASE Instument is being adapted to other aircraft platforms to support planned missions and to increase its utility.

  5. Pumping of titanium sapphire laser

    NASA Astrophysics Data System (ADS)

    Jelínková, H.; Vaněk, P.; Valach, P.; Hamal, K.; Kubelka, J.; Škoda, V.; Jelínek, M.

    1993-02-01

    Two methods of Ti:Sapphire pumping for the generation of tunable laser radiation in the visible region were studied. For coherent pumping, the radiation of the second harmonic of a Nd:YAP laser was used and a maximum output energy of E out=4.5 mJ was reached from the Ti:Sapphire laser. For noncoherent pumping, two different lengths of flashlamp pulses were used and a maximum of E out=300 mJ was obtained. Preliminary estimations of the wavelength range of tunability were made.

  6. Structural and electronic characterization of graphene grown by chemical vapor deposition and transferred onto sapphire

    NASA Astrophysics Data System (ADS)

    Joucken, Frédéric; Colomer, Jean-François; Sporken, Robert; Reckinger, Nicolas

    2016-08-01

    We present a combination of magnetotransport and local probe measurements on graphene grown by chemical vapor deposition on copper foil and subsequently transferred onto a sapphire substrate. A rather strong p-doping is observed (∼9 × 1012 cm-2) together with quite low carrier mobility (∼1350 cm2/V s). Atomic force and tunneling imaging performed on the transport devices reveals the presence of contaminants between sapphire and graphene, explaining the limited performance of our devices. The transferred graphene displays ridges similar to those observed whilst graphene is still on the copper foil. We show that, on sapphire, these ridges are made of different thicknesses of the contamination layer and that, contrary to what was reported for hBN or certain transition metal dichalcogenides, no self-cleansing process of the sapphire substrate is observed.

  7. Role of substrate quality on the performance of semipolar ( 11 2 ¯ 2 ) InGaN light-emitting diodes

    NASA Astrophysics Data System (ADS)

    Dinh, Duc V.; Corbett, Brian; Parbrook, Peter J.; Koslow, Ingrid. L.; Rychetsky, Monir; Guttmann, Martin; Wernicke, Tim; Kneissl, Michael; Mounir, Christian; Schwarz, Ulrich; Glaab, Johannes; Netzel, Carsten; Brunner, Frank; Weyers, Markus

    2016-10-01

    We compare the optical properties and device performance of unpackaged InGaN/GaN multiple-quantum-well light-emitting diodes (LEDs) emitting at ˜430 nm grown simultaneously on a high-cost small-size bulk semipolar ( 11 2 ¯ 2 ) GaN substrate (Bulk-GaN) and a low-cost large-size ( 11 2 ¯ 2 ) GaN template created on patterned ( 10 1 ¯ 2 ) r-plane sapphire substrate (PSS-GaN). The Bulk-GaN substrate has the threading dislocation density (TDD) of ˜105 cm-2-106 cm-2 and basal-plane stacking fault (BSF) density of 0 cm-1, while the PSS-GaN substrate has the TDD of ˜2 × 108 cm-2 and BSF density of ˜1 × 103 cm-1. Despite an enhanced light extraction efficiency, the LED grown on PSS-GaN has two-times lower internal quantum efficiency than the LED grown on Bulk-GaN as determined by photoluminescence measurements. The LED grown on PSS-GaN substrate also has about two-times lower output power compared to the LED grown on Bulk-GaN substrate. This lower output power was attributed to the higher TDD and BSF density.

  8. Light polarization sensitive photodetectors with m- and r-plane homoepitaxial ZnO/ZnMgO quantum wells

    SciTech Connect

    Tabares, G.; Hierro, A. Lopez-Ponce, M.; Muñoz, E.

    2015-02-09

    Homoepitaxial ZnO/(Zn,Mg)O multiple quantum wells (MQWs) grown with m- and r-plane orientations are used to demonstrate Schottky photodiodes sensitive to the polarization state of light. In both orientations, the spectral photoresponse of the MQW photodiodes shows a sharp excitonic absorption edge at 3.48 eV with a very low Urbach tail, allowing the observation of the absorption from the A, B and C excitonic transitions. The absorption edge energy is shifted by ∼30 and ∼15 meV for the m- and r-plane MQW photodiodes, respectively, in full agreement with the calculated polarization of the A, B, and C excitonic transitions. The best figures of merit are obtained for the m-plane photodiodes, which present a quantum efficiency of ∼11%, and a specific detectivity D* of ∼6.4 × 10{sup 10} cm Hz{sup 1/2}/W. In these photodiodes, the absorption polarization sensitivity contrast between the two orthogonal in-plane axes yields a maximum value of (R{sub ⊥}/R{sub ||}){sub max} ∼ 9.9 with a narrow bandwidth of ∼33 meV.

  9. Surface Structure of Protonated R-Sapphire (1$\\bar{1}$02) Studied by Sum-Frequency Vibrational Spectroscopy

    SciTech Connect

    Sung, Jaeho; Zhang, Luning; Tian, Chuanshan; Waychunas, Glenn A.; Shen, Y. Ron

    2011-03-23

    Sum frequency vibrational spectroscopy was used to study the protonated R-plane (1$\\bar{1}$02 ) sapphire surface. The OH stretch vibrational spectra show that the surface is terminated with three hydroxyl moieties, two from AlOH2 and one from Al2OH functional groups. The observed polarization dependence allows determination of the orientations of the three OH species. The results suggest that the protonated sapphire (1$\\bar{1}$02 ) surface differs from an ideal stoichimetric termination in a manner consistent with previous X-ray surface diffraction (crystal truncation rod) studies. However, in order to best explain the observed hydrogenbonding arrangement, surface oxygen spacing determined from the X-ray diffraction study requires modification.

  10. Structural and electrical properties of reactively sputtered InN thin films on AlN-buffered (00.1) sapphire substrates: Dependence on buffer and film growth temperatures and thicknesses

    NASA Astrophysics Data System (ADS)

    Kistenmacher, T. J.; Ecelberger, S. A.; Bryden, W. A.

    1993-08-01

    An extensive investigation of InN overlayers on AlN-buffered (00.1) sapphire by reactive magnetron sputtering has been undertaken and the dependencies of several basic materials properties (film thickness, development and quality of heteroepitaxy, film morphology, and electrical transport) on such key deposition parameters such as the growth temperatures of the insulating AlN buffer layer and the InN overlayer and their thicknesses have been determined. Three prominent effects of the AlN buffer layer are (1) the stabilization of heteroepitaxial growth over a broad range of film and buffer layer growth temperatures; (2) the attainment of a higher Hall mobility (up to 60 cm2/V s) over much of the same range; and, (3) the retention of heteroepitaxial growth, higher Hall mobility, and pseudo-two-dimensional growth even in the limit of an InN layer of ˜40 Å. In the context of a structure-zone model, the AlN buffer layer is projected to effectively raise the growth temperature of the InN thin film. The increase in effective growth temperature is, however, insufficient to overcome low atomic and cluster mobility and to achieve single-crystal InN thin film growth.

  11. Germanium Nanocrystals Embedded in Sapphire

    SciTech Connect

    Xu, Q.; Sharp, I.D.; Liao, C.Y.; Yi, D.O.; Ager III, J.W.; Beeman, J.W.; Yu, K.M.; Chrzan, D.C.; Haller, E.E.

    2005-04-15

    {sup 74}Ge nanocrystals are formed in a sapphire matrix by ion implantation followed by damage. Embedded nanocrystals experience large compressive stress relative to bulk, as embedded in sapphire melt very close to the bulk melting point (Tm = 936 C) whereas experience considerably lower stresses. Also, in situ TEM reveals that nanocrystals ion-beam-synthesized nanocrystals embedded in silica are observed to be spherical and measured by Raman spectroscopy of the zone center optical phonon. In contrast, reveals that the nanocrystals are faceted and have a bi-modal size distribution. Notably, the matrix remains crystalline despite the large implantation dose and corresponding thermal annealing. Transmission electron microscopy (TEM) of as-grown samples those embedded in silica exhibit a significant melting point hysteresis around T{sub m}.

  12. Sapphire decomposition and inversion domains in N-polar aluminum nitride

    SciTech Connect

    Hussey, Lindsay White, Ryan M.; Kirste, Ronny; Bryan, Isaac; Guo, Wei; Osterman, Katherine; Haidet, Brian; Bryan, Zachary; Bobea, Milena; Collazo, Ramón; Sitar, Zlatko; Mita, Seiji

    2014-01-20

    Transmission electron microscopy (TEM) techniques and potassium hydroxide (KOH) etching confirmed that inversion domains in the N-polar AlN grown on c-plane sapphire were due to the decomposition of sapphire in the presence of hydrogen. The inversion domains were found to correspond to voids at the AlN and sapphire interface, and transmission electron microscopy results showed a V-shaped, columnar inversion domain with staggered domain boundary sidewalls. Voids were also observed in the simultaneously grown Al-polar AlN, however no inversion domains were present. The polarity of AlN grown above the decomposed regions of the sapphire substrate was confirmed to be Al-polar by KOH etching and TEM.

  13. Intense laser propagation in sapphire

    NASA Astrophysics Data System (ADS)

    Tate, Jennifer L.

    When a sufficiently energetic short laser pulse propagates through a medium it can generate an explosive increase in bandwidth leading to the creation of white light; this is known as supercontinuum generation (SCG). Although it is frequently referred to as a single process, SCG is actually the result of many different parallel and competing processes. In this work we investigate the contribution of the individual physical processes underlying the SCG effect, focusing specifically on Raman processes and plasma formation in sapphire. For our experiments we use an amplified Ti:sapphire laser system producing nearly transform limited 60 fs pulses at 800 nm. Typical pulse energies for the experiments are 1--3 muJ/pulse. Using a new experimental technique, the spectrally resolved interferometric double pump, we study the contribution of non-instantaneous Raman effects. We see two distinct Raman contributions in sapphire which are much stronger than indicated in previous work. One Raman process has a period of approximately 185 fs and is related to an available optical phonon; the second Raman process has a period of 20 fs and is related to defect states caused by an oxygen vacancy in the sapphire crystal. Data from the same experiment show that the SCG light is not phase stable at low excitation energies, but that the phase stability is restored and saturates with increasing laser intensity. In a separate experiment we investigate the dynamics of plasma formation using a pump-probe technique. We observe that in sapphire both the formation and the decay of the plasma occur over time scales much longer than predicted by current theory. The plasma rise time is ˜225 fs, while the decay time is ˜150 ps; we also observe that these values do not depend on input pulse energy. In addition to these experiments, we perform a numerical integration of the extended (3 + 1) dimensional nonlinear Schrodinger equation, which models the propagation of a short laser pulse through a

  14. Microwave Frequency Discriminator With Sapphire Resonator

    NASA Technical Reports Server (NTRS)

    Santiago, David G.; Dick, G. John

    1994-01-01

    Cooled sapphire resonator provides ultralow phase noise. Apparatus comprises microwave oscillator operating at nominal frequency of about 8.1 GHz, plus frequency-discriminator circuit measuring phase fluctuations of oscillator output. One outstanding feature of frequency discriminator is sapphire resonator serving as phase reference. Sapphire resonator is dielectric ring resonator operating in "whispering-gallery" mode. Functions at room temperature, but for better performance, typically cooled to operating temperature of about 80 K. Similar resonator described in "Sapphire Ring Resonator for Microwave Oscillator" (NPO-18082).

  15. γ-LiAlO 2 layer on (0 0 0 1) sapphire fabricated by vapor transport equilibration

    NASA Astrophysics Data System (ADS)

    Zhou, Shengming; Xu, Jun; Li, Shuzhi; Yang, Weiqiao; Peng, Guanliang; Zou, Jun; Wang, Yinzhen; Liu, Shiliang; Zhao, Guangjun; Li, Hongjun; Zhou, Guoqing; Hang, Yin

    2004-07-01

    Single-phase γ-LiAlO 2 layer with a preferred (1 0 0) orientation on (0 0 0 1) sapphire substrate is successfully fabricated by vapor transport equilibration (VTE) technique. The VTE-treated surface of (0 0 0 1) sapphire is polycrystalline shown to be a single-phase of γ-LiAlO 2 at low VTE temperature (750-900°C), and becomes highly oriented in [1 0 0] direction at proper VTE temperature of ˜1100°C. The transparence of the obtained γ-LiAlO 2//sapphire(0 0 0 1) is greatly enhanced as the γ-LiAlO 2 layer becomes oriented. These results reveal the possibility of fabricating γ-LiAlO 2(1 0 0)//sapphire(0 0 0 1) composite substrate by VTE for M-plane GaN-based epitaxial film.

  16. Growth of polar and non-polar nitride semiconductor quasi-substrates by hydride vapor phase epitaxy for the development of optoelectronic devices by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Moldawer, Adam Lyle

    The family of nitride semiconductors has had a profound influence on the development of optoelectronics for a large variety of applications. However, as of yet there are no native substrates commercially available that are grown by liquid phase methods as with Si and GaAs. As a result, the majority of electronic and optoelectronic devices are grown heteroepitaxially on sapphire and SiC. This PhD research addresses both the development of polar and non-polar GaN and AIN templates by Hydride Vapor Phase Epitaxy (HVPE) on sapphire and SiC substrates, as well as the growth and characterization of optoelectronic devices on these templates by molecular beam epitaxy (MBE). Polar and non-polar GaN templates have been grown in a vertical HVPE reactor on the C- and R-planes of sapphire respectively. The growth conditions have been optimized to allow the formation for thick (50um) GaN templates without cracks. These templates were characterized structurally by studying their surface morphologies by SEM and AFM, and their structure through XRD and TEM. The polar C-plane GaN templates were found to be atomically smooth. However, the surface morphology of the non-polar GaN films grown on the R-plane of sapphire were found to have a facetted surface morphology, with the facets intersecting at 120° angles. This surface morphology reflects an equilibrium growth, since the A-plane of GaN grows faster than the M-planes of GaN due to the lower atomic density of the plane. For the development of deep-UV optoelectronics, it is required to grow AIGaN quantum wells on AIN templates. However, since AIN is a high melting point material, such templates have to be grown at higher temperatures, close to half the melting point of the material (1500 °C). As these temperatures cannot be easily obtained by traditional furnace heating, an HVPE reactor has been designed to heat the substrate inductively to these temperatures. This apparatus has been used to grow high-quality, transparent AIN films

  17. Effects of the high-temperature-annealed self-buffer layer on the improved properties of ZnO epilayers grown by helicon-wave-excited-plasma sputtering epitaxy on a-plane sapphire substrates

    NASA Astrophysics Data System (ADS)

    Koyama, T.; Fouda, A. N.; Shibata, N.; Chichibu, S. F.

    2007-10-01

    The use of the high-temperature-annealed self-buffer layer (HITAB) enabled to observe free A-and B-exciton emissions at 9K from ZnO heteroepitaxial films grown by the sputtering epitaxy method using a helicon-wave-excited plasma on uniaxially nearly lattice-matched (112¯0) Al2O3 substrates. The result was correlated with a twofold decrease in the densities of threading dislocations having both the screw and edge components, according to the dislocation concealing in ZnO HITAB due to lateral mass transport of low-temperature deposited ZnO nanocrystalline grains during high temperature annealing.

  18. Chemical mechanical polishing (CMP) of sapphire

    NASA Astrophysics Data System (ADS)

    Zhu, Honglin

    The concept of chemical mechanical polishing (CMP) was examined for finishing sapphire. In this study sapphire was used as a model system for oxide ceramics. The removal rates were determined by weight loss. Surface quality and structure were characterized with surface probe microscopy (SPM). Polishing experiments were designed to test the chemically modified surface layer. A series of abrasives with various hardnesses including mono-crystalline and polycrystalline diamond, alpha and gamma alumina, zirconia, ceria and silica were used. Diaspore was also evaluated. The results indicated that, with similar particle size and shape, harder abrasives do not necessarily cause faster material removal and better surface finish, and abrasives with hardness equal to or less than sapphire such as alpha alumina and gamma alumina achieved the best surface finish and efficient material removal. A hypothesis was proposed that the sapphire surface was modified by water to form a thin hydration laver with structure and hardness close to diaspore. Abrasives with a hardness between diaspore and sapphire polished the c-plane of sapphire with good surface finish and efficient removal. SPM indicated the hydration layer on the c-plane surface was about 1 nm thick. Removal rate and surface finish as a function of pH were also examined on c-plane sapphire with nano-alumina abrasives. The removal rate as a function of pH was compared to the solubility behavior of alumina. The results showed the deviation of pH from the lowest solubility pH for alumina (pH = 5) was a driving force for the surface reaction to form a hydration layer. The anisotropy of sapphire strongly affects removal rate and surface quality in CMP. The relationships among orientation. pH and abrasive were studied for sapphire with c (0001), a (11-20), and m (10-10) planes. Based on the results, the CMP process for sapphire includes chemical reaction of the surface to form a thin reaction layer that is softer than sapphire

  19. Effect of microstructure on Au/sapphire interfacial thermal resistance

    SciTech Connect

    Xu Yibin; Kato, Ryozo; Goto, Masahiro

    2010-11-15

    We deposit Au films on single crystal sapphire substrates by sputtering and evaporation methods. The microstructure characteristics such as crystal textures, grain sizes, and fraction of contacted area of the films are examined by x-ray diffraction and transmission electron microscopy. The sputtered films have an average grain size of about 200 nm and perfectly attach to the substrates; the as-evaporated films partially attach to the substrate; the grain size varies from 10 to 30 nm, and after annealing, increases to 50 nm. Au{sub 2}Al phase is observed in the annealed samples. The interfacial thermal resistance is measured by a frequency domain thermoreflectance method. The thermal resistance of the sputtered Au/sapphire interfaces is 35.5x10{sup -9} m{sup 2} K W{sup -1}, and those of the evaporated samples are up to three times as large as this value. The change in interfacial thermal resistance is explained by the effect of detachment using a parallel arranged thermal resistance model, the effect of grain size, and the influence of chemical bonding at the interfaces.

  20. Large scale metal-free synthesis of graphene on sapphire and transfer-free device fabrication.

    PubMed

    Song, Hyun Jae; Son, Minhyeok; Park, Chibeom; Lim, Hyunseob; Levendorf, Mark P; Tsen, Adam W; Park, Jiwoong; Choi, Hee Cheul

    2012-05-21

    Metal catalyst-free growth of large scale single layer graphene film on a sapphire substrate by a chemical vapor deposition (CVD) process at 950 °C is demonstrated. A top-gated graphene field effect transistor (FET) device is successfully fabricated without any transfer process. The detailed growth process is investigated by the atomic force microscopy (AFM) studies. PMID:22526246

  1. Advances in sapphire optical fiber sensors

    NASA Technical Reports Server (NTRS)

    Wang, Anbo; Wang, George Z.; Gollapudi, Sridhar; May, Russell G.; Murphy, Kent A.; Claus, Richard O.

    1993-01-01

    We describe the development and testing of two sapphire fiber sensor designs intended for use in high temperature environments. The first is a birefringence-balanced polarimetric sapphire fiber sensor. In this sensor, two single crystal sapphire rods, acting as the birefringence sensing element, are connected to each other in such a way that the slow axis of the first rod is aligned along with the fast axis of the second rod, and the fast axis of the first rod is along the slow axis of the second rod. This sensor has been demonstrated for measurement of temperature up to 1500 C. The second is a sapphire-fiber-based intrinsic interferometric sensor. In this sensor, a length of uncoated, unclad, structural-graded multimode sapphire fiber is fusion spliced to a singlemode silica fiber to form a Fabry-Perot cavity. The reflections from the silica-to-sapphire fiber splice and the free endface of the sapphire fiber give rise to the interfering fringe output. This sensor has been demonstrated for the measurement of temperature above 1510 C, and a resolution of 0.1 C has been obtained.

  2. Change in equilibrium position of misfit dislocations at the GaN/sapphire interface by Si-ion implantation into sapphire—I. Microstructural characterization

    SciTech Connect

    Lee, Sung Bo Han, Heung Nam Lee, Dong Nyung; Ju, Jin-Woo; Kim, Young-Min; Yoo, Seung Jo; Kim, Jin-Gyu

    2015-07-15

    Much research has been done to reduce dislocation densities for the growth of GaN on sapphire, but has paid little attention to the elastic behavior at the GaN/sapphire interface. In this study, we have examined effects of the addition of Si to a sapphire substrate on its elastic property and on the growth of GaN deposit. Si atoms are added to a c-plane sapphire substrate by ion implantation. The ion implantation results in scratches on the surface, and concomitantly, inhomogeneous distribution of Si. The scratch regions contain a higher concentration of Si than other regions of the sapphire substrate surface, high-temperature GaN being poorly grown there. However, high-temperature GaN is normally grown in the other regions. The GaN overlayer in the normally-grown regions is observed to have a lower TD density than the deposit on the bare sapphire substrate (with no Si accommodated). As compared with the film on an untreated, bare sapphire, the cathodoluminescence defect density decreases by 60 % for the GaN layer normally deposited on the Si-ion implanted sapphire. As confirmed by a strain mapping technique by transmission electron microscopy (geometric phase analysis), the addition of Si in the normally deposited regions forms a surface layer in the sapphire elastically more compliant than the GaN overlayer. The results suggest that the layer can largely absorb the misfit strain at the interface, which produces the overlayer with a lower defect density. Our results highlight a direct correlation between threading-dislocation density in GaN deposits and the elastic behavior at the GaN/sapphire interface, opening up a new pathway to reduce threading-dislocation density in GaN deposits.

  3. Sapphire reinforced alumina matrix composites

    NASA Technical Reports Server (NTRS)

    Jaskowiak, Martha H.; Setlock, John A.

    1994-01-01

    Unidirectionally reinforced A1203 matrix composites have been fabricated by hot pressing. Approximately 30 volume % of either coated or uncoated sapphire fiber was used as reinforcement. Unstabilized ZrO2 was applied as the fiber coating. Composite mechanical behavior was analyzed both after fabrication and after additional heat treatment. The results of composite tensile tests were correlated with fiber-matrix interfacial shear strengths determined from fiber push-out tests. Substantially higher strength and greater fiber pull-out were observed for the coated fiber composites for all processing conditions studied. The coated fiber composites retained up to 95% and 87% of their as-fabricated strength when heat treated at 14000C for 8 or 24 hours, respectively. Electron microscopy analysis of the fracture surfaces revealed extensive fiber pull-out both before and after heat treatment.

  4. LASE Ti:Sapphire Laser

    NASA Technical Reports Server (NTRS)

    1995-01-01

    In the photo, Dr. Larry B. Petway (Science Applications International Corp.) is making final adjustments to the Ti:Sapphire Laser in preparing the Lidar Atmospheric Sensing Experiment (LASE) Instrument for intergration into a NASA/ER-2 aircraft. LASE is the first fully- engineered, autonomous differential Absorption Lidar (DIAL) System for the measurement of water vapor, aerosol and cloud in the troposphere. LASE uses a double-pulsed Ti:Sapphire laser for the transmitter with a 30 ns pulse length and 150mJ/pulse. The laser beam is seeded to operate on a selected water vapor absorption line in the 815-nm region using a laser diode and an onboard absorption reference cell. A 40 cm diameter telescope collects the backscattered signals and directs them onto two detectors. LASE collects DIAL data at 5 Hz while flying at altitudes from 16-21 km. LASE was designed to operate autonomously within the environment and physical constraints of the ER-2 aircraft and to make water vapor profile measurements across the troposphere with accuracy having less than 6% of error. No other instrument can provide the spatial coverage and accuracy of LASE.Water vapor is the most radiative active gas in the troposphere, and the lack of understanding about its distribution provides one of the largest uncertainties in modeling climate change. LASE has demonstrated the necessary potential in providing high resolution water vapor measurements that can advance the studies of tropospheric water vapor distributions. LASE has flown 19 times during the development of the instrument and the validation of the science data. A joint international field mission was completed in the summer of 1996; adding 9 more successful flights. The LASE Instument is being adapted to other aircraft platforms to support planned missions and to increase its utility.

  5. Single Crystal Sapphire Optical Fiber Sensor Instrumentation

    SciTech Connect

    Anbo Wang; Russell May; Gary R. Pickrell

    2000-10-28

    The goal of this 30 month program is to develop reliable accurate temperature sensors based on single crystal sapphire materials that can withstand the temperatures and corrosive agents present within the gasifier environment. The research for this reporting period has been segregated into two parallel paths--corrosion resistance measurements for single crystal sapphire fibers and investigation of single crystal sapphire sensor configurations. The ultimate goal of this phase one segment is to design, develop and demonstrate on a laboratory scale a suitable temperature measurement device that can be field tested in phase two of the program.

  6. Temperature dependence of sapphire fiber Raman scattering

    DOE PAGES

    Liu, Bo; Yu, Zhihao; Tian, Zhipeng; Homa, Daniel; Hill, Cary; Wang, Anbo; Pickrell, Gary

    2015-04-27

    Anti-Stokes Raman scattering in sapphire fiber has been observed for the first time. Temperature dependence of Raman peaks’ intensity, frequency shift, and linewidth were also measured. Three anti-Stokes Raman peaks were observed at temperatures higher than 300°C in a 0.72-m-long sapphire fiber excited by a second-harmonic Nd YAG laser. The intensity of anti-Stokes peaks are comparable to that of Stokes peaks when the temperature increases to 1033°C. We foresee the combination of sapphire fiber Stokes and anti-Stokes measurement in use as a mechanism for ultrahigh temperature sensing.

  7. Anisotropic strain relaxation and the resulting degree of polarization by one- and two-step growth in nonpolar a-plane GaN grown on r-sapphire substrate

    SciTech Connect

    Feng, Shih-Wei Chen, Yu-Yu; Lai, Chih-Ming; Tu, Li-Wei; Han, Jung

    2013-12-21

    Anisotropic strain relaxation and the resulting degree of polarization of the electronic transition in nonpolar a-plane GaN using one- and two-step growth are studied. By using two-step growth, a slower coalescence and a longer roughening-recovery process lead to larger anisotropic strain relaxation, a less striated surface, and lower densities of basal stacking fault (BSF) and prismatic stacking fault (PSF). It is suggested that anisotropic in-plane strains, surface striation, and BSF and PSF densities in nonpolar a-GaN are consequences of the rate of coalescence, the period of roughening-recovery process, and the degree of anisotropic strain relaxation. In addition, the two-step growth mode can enhance the degree of polarization of the electronic transition. The simulation results of the k⋅p perturbation approach show that the oscillator strength and degree of polarization of the electronic transition strongly depend on the in-plane strains upon anisotropic in-plane strain relaxation. The research results provide important information for optimized growth of nonpolar III-nitrides. By using two-step growth and by fabricating the devices on the high-quality nonpolar free-standing GaN substrates, high-efficiency nonpolar a-plane InGaN LEDs can be realized. Nonpolar a-plane InGaN/GaN LEDs can exhibit a strongly polarized light to improve the contrast, glare, eye discomfort and eye strain, and efficiency in display application.

  8. Thermal debracketing of single crystal sapphire brackets.

    PubMed

    Rueggeberg, F A; Lockwood, P E

    1992-01-01

    Because of their optical clarity, single crystal sapphire brackets provide an esthetic advantage over many other types of orthodontic brackets. However, debonding of these brackets has caused iatrogenic damage to enamel. Thermal debonding has been proposed for use in removing sapphire brackets without causing damage to teeth. This study determined the temperature required at the enamel/resin interface to thermally debond sapphire brackets from etched bovine enamel using 23 different commercially available orthodontic resins and one experimental product. The results indicate a wide range of debonding temperatures for the various resins. As a group, the powder-liquid materials had a statistically lower debonding temperature than the two-paste, the no-mix products, or the light-cured materials, for which the temperatures were all similar. This paper presents relative information a clinician can use in selecting an orthodontic bonding resin to minimize thermal damage to the teeth while debonding sapphire brackets.

  9. High Q Miniature Sapphire Acoustic Resonator

    NASA Technical Reports Server (NTRS)

    Wang, Rabi T.; Tjoelker, R. L.

    2010-01-01

    We have demonstrated high Q measurements in a room temperature Miniature Sapphire Acoustic Resonator (MSAR). Initial measurements of bulk acoustic modes in room temperature sapphire at 39 MHz have demonstrated a Q of 8.8 x 10(exp 6). The long term goal of this work is to integrate such a high Q resonator with small, low noise quartz oscillator electronics, providing a fractional frequency stability better than 1 x 10(exp -14) @ 1s.

  10. Nitridation of an unreconstructed and reconstructed (√31 ×√31)R ± 9° (0001) sapphire surface in an ammonia flow

    SciTech Connect

    Milakhina, D. S. Malin, T. V.; Mansurov, V. G.; Galitsin, Yu. G.; Zhuravlev, K. S.

    2015-07-15

    This paper is devoted to the study of the nitridation of unreconstructed and reconstructed (√31 ×√31)R ± 9° (0001) sapphire surfaces in an ammonia flow by reflection high-energy electron diffraction (RHEED). The experimental results show that sapphire nitridation occurs on the unreconstructed (1 × 1) surface, which results in AlN phase formation on the substrate surface. However, if sapphire nitridation is preceded by high-temperature annealing (1150°C) resulting in sapphire surface reconstruction with formation of the (√31 ×√31)R ± 9° surface, the crystalline AlN phase on the sapphire surface is not formed during surface exposure to an ammonia flow.

  11. Sapphire: A kinking nonlinear elastic solid

    NASA Astrophysics Data System (ADS)

    Basu, S.; Barsoum, M. W.; Kalidindi, S. R.

    2006-03-01

    Kinking nonlinear elastic (KNE) solids are a recently identified large class of solids that deform fully reversibly by the formation of dislocation-based kink bands [Barsoum et al. Phys. Rev. Lett. 92, 255508 (2004)]. We further conjectured that a high c/a ratio-that ensures that only basal slip is operative-is a sufficient condition for a solid to be KNE. The c/a ratio of sapphire is 2.73 and thus, if our conjecture is correct, it should be a KNE solid. Herein by repeatedly loading-up to 30 times-the same location of sapphire single crystals of two orientations-A and C-with a 1 μm radius spherical nanoindenter, followed by atomic force microscopy, we showed that sapphire is indeed a KNE solid. After pop-ins of the order of 100 nm, the repeated loadings give rise to fully reversible, reproducible hysteresis loops wherein the energy dissipated per unit volume per cycle Wd is of the order of 0.5 GJ/m3. Wd is due to the back and fro motion of the dislocations making up the incipient kink bands that are fully reversible. The results presented here strongly suggest that-like in graphite and mica-kink bands play a more critical role in the room temperature constrained deformation of sapphire than had hitherto been appreciated. Our interpretation is also in agreement with, and can explain most, recent nanoindentation results on sapphire.

  12. Submicron diameter single crystal sapphire optical fiber

    SciTech Connect

    Hill, Cary; Homa, Daniel; Liu, Bo; Yu, Zhihao; Wang, Anbo; Pickrell, Gary

    2014-10-02

    In this work, a submicron-diameter single crystal sapphire optical fiber was demonstrated via wet acid etching at elevated temperatures. Etch rates on the order 2.3 µm/hr were achievable with a 3:1 molar ratio sulfuric-phosphoric acid solution maintained at a temperature of 343°C. A sapphire fiber with an approximate diameter of 800 nm was successfully fabricated from a commercially available fiber with an original diameter of 50 µm. The simple and controllable etching technique provides a feasible approach to the fabrication of unique waveguide structures via traditional silica masking techniques. The ability to tailor the geometry of sapphire optical fibers is the first step in achieving optical and sensing performance on par with its fused silica counterpart.

  13. Submicron diameter single crystal sapphire optical fiber

    DOE PAGES

    Hill, Cary; Homa, Daniel; Liu, Bo; Yu, Zhihao; Wang, Anbo; Pickrell, Gary

    2014-10-02

    In this work, a submicron-diameter single crystal sapphire optical fiber was demonstrated via wet acid etching at elevated temperatures. Etch rates on the order 2.3 µm/hr were achievable with a 3:1 molar ratio sulfuric-phosphoric acid solution maintained at a temperature of 343°C. A sapphire fiber with an approximate diameter of 800 nm was successfully fabricated from a commercially available fiber with an original diameter of 50 µm. The simple and controllable etching technique provides a feasible approach to the fabrication of unique waveguide structures via traditional silica masking techniques. The ability to tailor the geometry of sapphire optical fibers ismore » the first step in achieving optical and sensing performance on par with its fused silica counterpart.« less

  14. Surface Functionalized Graphene Biosensor on Sapphire for Cancer Cell Detection.

    PubMed

    Joe, Daniel J; Hwang, Jeonghyun; Johnson, Christelle; Cha, Ho-Young; Lee, Jo-Won; Shen, Xiling; Spencer, Michael G; Tiwari, Sandip; Kim, Moonkyung

    2016-01-01

    Graphene has several unique physical, optical and electrical properties such as a two-dimensional (2D) planar structure, high optical transparency and high carrier mobility at room temperature. These make graphene interesting for electrical biosensing. Using a catalyst-free chemical vapor deposition (CVD) method, graphene film is grown on a sapphire substrate. There is a single or a few sheets as confirmed by Raman spectroscopy and atomic force microscopy (AFM). Electrical graphene biosensors are fabricated to detect large-sized biological analytes such as cancer cells. Human colorectal carcinoma cells are sensed by the resistance change of an active bio-functionalized graphene device as the cells are captured by the immobilized antibody surface. The functionalized sensors show an increase in resistance as large as ~20% of the baseline with a small number of adhered cells. This study suggests that the bio-functionalized electrical graphene sensors on sapphire, which is a highly transparent material, can potentially detect circulating tumor cells (CTCs) and monitor cellular electrical behavior while being compatible with fluorescence-based optical-detection bioassays. PMID:27398439

  15. Bonding of sapphire to sapphire by eutectic mixture of aluminum oxide and zirconium oxide

    NASA Technical Reports Server (NTRS)

    Deluca, J. J. (Inventor)

    1979-01-01

    An element comprising sapphire, ruby or blue sapphire can be bonded to another element of such material with a eutectic mixture of aluminum oxide and zirconium oxide. The bonding mixture may be applied in the form of a distilled water slurry or by electron beam vapor deposition. In one embodiment the eutectic is formed in situ by applying a layer of zirconium oxide and then heating the assembly to a temperature above the eutectic temperature and below the melting point of the material from which the elements are formed. The formation of a sapphire rubidium maser cell utilizing eutectic bonding is shown.

  16. Bonding of sapphire to sapphire by eutectic mixture of aluminum oxide and zirconium oxide

    NASA Technical Reports Server (NTRS)

    Deluca, J. J. (Inventor)

    1975-01-01

    Bonding of an element comprising sapphire, ruby or blue sapphire to another element of such material with a eutectic mixture of aluminum oxide and zirconium oxide is discussed. The bonding mixture may be applied in the form of a distilled water slurry or by electron beam vapor deposition. In one embodiment the eutectic is formed in situ by applying a layer of zirconium oxide and then heating the assembly to a temperature above the eutectic temperature and below the melting point of the material from which the elements are formed. The formation of a sapphire rubidium maser cell utilizing eutectic bonding is shown.

  17. Laser-induced desorption from sapphire surfaces

    SciTech Connect

    Hamza, A.V.; Schildbach, M.A.

    1992-03-01

    Laser-induced desorption of energetic ({approximately}7eV) aluminum ions was observed from clean and water-covered sapphire (1102) surfaces using time-of-flight mass spectrometry with laser wavelengths of 1064, 355, and 266 nm. In sharp contrast, O{sup +} (H{sup +} and OH{sup +}) ions were observed in electron-induced desorption measurements with 300 eV electrons from the bare (water- covered) (1102) surface. Sapphire surfaces were characterized with low energy electron diffraction, reflection electron energy loss spectroscopy, and Auger electron spectroscopy. 8 refs.

  18. Pseudorotational epitaxy of self-assembled octadecyltrichlorosilane monolayers on sapphire (0001)

    DOE PAGES

    Steinrück, H. -G.; Magerl, A.; Deutsch, M.; Ocko, B. M.

    2014-10-06

    The structure of octadecyltrichlorosilane self-assembled monolayers (SAMs) on sapphire (0001) was studied by Å-resolution surface-specific x-ray scattering methods. The monolayer was found to consist of three sublayers where the outermost layer corresponds to vertically oriented, closely packed alkyl tails. Laterally, the monolayer is hexagonally packed and exhibits pseudorotational epitaxy to the sapphire, manifested by a broad scattering peak at zero relative azimuthal rotation, with long powderlike tails. The lattice mismatch of ~1% – 3% to the sapphire’s and the different length scale introduced by the lateral Si-O-Si bonding prohibit positional epitaxy. However, the substrate induces an intriguing increase in themore » crystalline coherence length of the SAM’s powderlike crystallites when rotationally aligned with the sapphire’s lattice. As a result, the increase correlates well with the rotational dependence of the separation of corresponding substrate-monolayer lattice sites.« less

  19. Pseudorotational epitaxy of self-assembled octadecyltrichlorosilane monolayers on sapphire (0001)

    SciTech Connect

    Steinrück, H. -G.; Magerl, A.; Deutsch, M.; Ocko, B. M.

    2014-10-06

    The structure of octadecyltrichlorosilane self-assembled monolayers (SAMs) on sapphire (0001) was studied by Å-resolution surface-specific x-ray scattering methods. The monolayer was found to consist of three sublayers where the outermost layer corresponds to vertically oriented, closely packed alkyl tails. Laterally, the monolayer is hexagonally packed and exhibits pseudorotational epitaxy to the sapphire, manifested by a broad scattering peak at zero relative azimuthal rotation, with long powderlike tails. The lattice mismatch of ~1% – 3% to the sapphire’s and the different length scale introduced by the lateral Si-O-Si bonding prohibit positional epitaxy. However, the substrate induces an intriguing increase in the crystalline coherence length of the SAM’s powderlike crystallites when rotationally aligned with the sapphire’s lattice. As a result, the increase correlates well with the rotational dependence of the separation of corresponding substrate-monolayer lattice sites.

  20. Si nanowire growth on sapphire: Classical incubation, reverse reaction, and steady state supersaturation

    SciTech Connect

    Shakthivel, Dhayalan; Rathkanthiwar, Shashwat; Raghavan, Srinivasan

    2015-04-28

    Si nanowire growth on sapphire substrates by the vapor-liquid-solid (VLS) method using Au catalyst particles has been studied. Sapphire was chosen as the substrate to ensure that the vapor phase is the only source of Si. Three hitherto unreported observations are described. First, an incubation period of 120–480 s, which is shown to be the incubation period as defined in classical nucleation theory, is reported. This incubation period permits the determination of a desolvation energy of Si from Au-Si alloys of 15 kT. Two, transmission electron microscopy studies of incubation, point to Si loss by reverse reaction as an important part of the mechanism of Si nanowire growth by VLS. Three, calculations using these physico-chemical parameters determined from incubation and measured steady state growth rates of Si nanowires show that wire growth happens from a supersaturated catalyst droplet.

  1. Optical transmission of strained GaN/sapphire structures

    NASA Astrophysics Data System (ADS)

    Kurin, S. Yu; Puzyk, M. V.; Ermakov, I. A.; Antipov, A. A.; Barash, I. S.; Roenkov, A. D.; Ratnikov, V. V.; Usikov, A. S.; Papchenko, B. P.; Helava, H.; Makarov, Yu N.; Chernyakov, A. E.

    2016-08-01

    In this work we correlated transmission spectra of GaN layers grown on sapphire substrates by hydride vapour phase epitaxy with biaxial stress measured in the layers. It was observed that the sign of stress in the GaN layer is changed by Si doping and growth conditions. Transmission curves are shifted relative to each other depending on the stress in the layer. The cut-off wavelength of the transmission curves has a tendency to shift near parallel to a shorter wavelength range when the GaN layer is under the compression biaxial stress. When the GaN layer is under the tensile biaxial stress the cut off wavelength has a tendency to shift near parallel to a longer wavelength range).

  2. Temperature-Compensated Sapphire Microwave Resonator

    NASA Technical Reports Server (NTRS)

    Dick, G. John; Santiago, David G.

    1996-01-01

    Sapphire-dielectric-ring microwave resonator operating in "whispering-gallery" electromagnetic mode features differential-thermal-expansion design providing temperature compensation for ultrahigh frequency stability. Designed to minimize frequency fluctuations caused by temperature fluctuations at normal temperature equal to or even somewhat greater than temperature of liquid nitrogen. Ancillary equipment needed for operation smaller and less expensive, and liquid nitrogen used as coolant.

  3. Influence of Si doping on the infrared reflectance characteristics of GaN grown on sapphire

    NASA Astrophysics Data System (ADS)

    Hou, Y. T.; Feng, Z. C.; Chua, S. J.; Li, M. F.; Akutsu, N.; Matsumoto, K.

    1999-11-01

    Si-doped GaN films grown on sapphire are investigated by infrared reflectance. A damping behavior of the interference fringes is observed, and interpreted to be due to the presence of an interface layer between the film and the substrate. A theoretical calculation using a two-layer model to take into account the interface layer resulted in this damping in agreement with the experiment. The damping behavior and an improvement of interface properties by Si incorporation are demonstrated.

  4. Low Temperature Rhombohedral Single Crystal SiGe Epitaxy on c-plane Sapphire

    NASA Technical Reports Server (NTRS)

    Duzik, Adam J.; Choi, Sang H.

    2016-01-01

    Current best practice in epitaxial growth of rhombohedral SiGe onto (0001) sapphire (Al2O3) substrate surfaces requires extreme conditions to grow a single crystal SiGe film. Previous models described the sapphire surface reconstruction as the overriding factor in rhombohedral epitaxy, requiring a high temperature Al-terminated surface for high quality films. Temperatures in the 850-1100 C range were thought to be necessary to get SiGe to form coherent atomic matching between the (111) SiGe plane and the (0001) sapphire surface. Such fabrication conditions are difficult and uneconomical, hindering widespread application. This work proposes an alternative model that considers the bulk sapphire structure and determines how the SiGe film nucleates and grows. Accounting for thermal expansion effects, calculations using this new model show that both pure Ge and SiGe can form single crystal films in the 450-550 C temperature range. Experimental results confirm these predictions, where x-ray diffraction and atomic force microscopy show the films fabricated at low temperature rival the high temperature films in crystallographic and surface quality. Finally, an explanation is provided for why films of comparable high quality can be produced in either temperature range.

  5. Low temperature rhombohedral single crystal SiGe epitaxy on c-plane sapphire

    NASA Astrophysics Data System (ADS)

    Duzik, Adam J.; Choi, Sang H.

    2016-04-01

    Current best practice in epitaxial growth of rhombohedral SiGe onto (0001) sapphire (Al2O3) substrate surfaces requires extreme conditions to grow a single crystal SiGe film. Previous models described the sapphire surface reconstruction as the overriding factor in rhombohedral epitaxy, requiring a high temperature Al-terminated surface for high quality films. Temperatures in the 850-1100°C range were thought to be necessary to get SiGe to form coherent atomic matching between the (111) SiGe plane and the (0001) sapphire surface. Such fabrication conditions are difficult and uneconomical, hindering widespread application. This work proposes an alternative model that considers the bulk sapphire structure and determines how the SiGe film nucleates and grows. Accounting for thermal expansion effects, calculations using this new model show that both pure Ge and SiGe can form single crystal films in the 450-550°C temperature range. Experimental results confirm these predictions, where x-ray diffraction and atomic force microscopy show the films fabricated at low temperature rival the high temperature films in crystallographic and surface quality. Finally, an explanation is provided for why films of comparable high quality can be produced in either temperature range.

  6. Structural characterization of Nb on sapphire as a buffer layer for MBE growth

    NASA Astrophysics Data System (ADS)

    Reimer, P. M.; Zabel, H.; Flynn, C. P.; Dura, J. A.

    1993-02-01

    Niobium films grown by molecular beam epitaxy on sapphire substrates are among the highest quality ones that thin-film metal science has yet produced. This system is in intense use as a buffer layer for epitaxial growth of other metal thin films, magnetic films and superlattices as well. We studied films of Nb [110] deposited by MBE on Al 2O 3 [11 overline20] substrates using high-precision X-ray diffraction. Rocking curves of the out-of-plane Nb (110) peak reveal a two-component line shape. The sharper component implies a mosaic distribution an order of magnitude sharper than bulk single crystal Nb and a transverse structural coherence length exceeding 10 3 nm. The atomic planes associated with the sharp component are exactly aligned with the sapphire (11 overline20) planes, while those associated with the broad component are slightly misaligned. Upon loading the Nb film with a small amount of hydrogen, we find a further, dramatic increase of the lateral coherence length. The resulting mosaic distribution of the sharp component appears to be limited only by that of the sapphire substrate. We will discuss the results in terms of strain relief by hydrogen-induced dislocation motion.

  7. Transfer-free graphene synthesis on sapphire by catalyst metal agglomeration technique and demonstration of top-gate field-effect transistors

    SciTech Connect

    Miyoshi, Makoto Arima, Yukinori; Kubo, Toshiharu; Egawa, Takashi; Mizuno, Masaya; Soga, Tetsuo

    2015-08-17

    Transfer-free graphene synthesis was performed on sapphire substrates by using the catalyst metal agglomeration technique, and the graphene film quality was compared to that synthesized on sputtered SiO{sub 2}/Si substrates. Raman scattering measurements indicated that the graphene film on sapphire has better structural qualities than that on sputtered SiO{sub 2}/Si substrates. The cross-sectional transmission microscopic study also revealed that the film flatness was drastically improved by using sapphire substrates instead of sputtered SiO{sub 2}/Si substrates. These quality improvements seemed to be due the chemical and thermal stabilities of sapphire. Top-gate field-effect transistors were fabricated using the graphene films on sapphire, and it was confirmed that their drain current can be modulated with applied gate voltages. The maximum field-effect mobilities were estimated to be 720 cm{sup 2}/V s for electrons and 880 cm{sup 2}/V s for holes, respectively.

  8. Sapphire Viewports for a Venus Probe

    NASA Technical Reports Server (NTRS)

    Bates, Stephen

    2012-01-01

    A document discusses the creation of a viewport suitable for use on the surface of Venus. These viewports are rated for 500 C and 100 atm pressure with appropriate safety factors and reliability required for incorporation into a Venus Lander. Sapphire windows should easily withstand the chemical, pressure, and temperatures of the Venus surface. Novel fixture designs and seals appropriate to the environment are incorporated, as are materials compatible with exploration vessels. A test cell was fabricated, tested, and leak rate measured. The window features polish specification of the sides and corners, soft metal padding of the sapphire, and a metal C-ring seal. The system safety factor is greater than 2, and standard mechanical design theory was used to size the window, flange, and attachment bolts using available material property data. Maintenance involves simple cleaning of the window aperture surfaces. The only weakness of the system is its moderate rather than low leak rate for vacuum applications.

  9. Compared growth mechanisms of Zn-polar ZnO nanowires on O-polar ZnO and on sapphire.

    PubMed

    Perillat-Merceroz, G; Thierry, R; Jouneau, P H; Ferret, P; Feuillet, G

    2012-03-30

    Controlling the growth of zinc oxide nanowires is necessary to optimize the performance of nanowire-based devices such as photovoltaic solar cells, nano-generators, or light-emitting diodes. With this in mind, we investigate the nucleation and growth mechanisms of ZnO nanowires grown by metalorganic vapor phase epitaxy either on O-polar ZnO or on sapphire substrates. Whatever the substrate, ZnO nanowires are Zn-polar, as demonstrated by convergent beam electron diffraction. For growth on O-polar ZnO substrate, the nanowires are found to sit on O-polar pyramids. As growth proceeds, the inversion domain boundary moves up in order to remain at the top of the O-polar pyramids. For growth on sapphire substrates, the nanowires may also originate from the sapphire/ZnO interface. The presence of atomic steps and the non-polar character of sapphire could be the cause of the Zn-polar crystal nucleation on sapphire, whereas it is proposed that the segregation of aluminum impurities could account for the nucleation of inverted domains for growth on O-polar ZnO.

  10. Electronically tuned Ti:sapphire laser

    SciTech Connect

    Wada, S.; Akagawa, K.; Tashiro, H.

    1996-05-01

    We have applied a birefringent acousto-optic crystal for wavelength tuning of a Ti:sapphire laser. A continuous-tuning range of 12 nm, which was limited by wavelength-dependent angle deviation of the beam deflection in the crystal, was extended to over 100 nm by optical correction. Fast and random access of lasing wavelengths by direct electronic tuning was demonstrated at a pulsed operation of 10 Hz. {copyright} {ital 1996 Optical Society of America.}

  11. Microstructure and residual stress in γ-LiAlO 2 layer fabricated by vapor transport equilibration on (1 1 2¯ 0) sapphire

    NASA Astrophysics Data System (ADS)

    Wang, Yinzhen; Yang, Weiqiao; Li, Shuzhi; Peng, Guangliang; Liu, Shiliang; Zou, Jun; Zhou, Shengming; Xu, Jun; zhang, Rong

    2004-09-01

    γ-LiAlO2 layers have been fabricated by vapor transport equilibration (VTE) technique on (1 1 2bar 0) sapphire substrate. Microstructure of γ-LiAlO2 layers is characterized by X-ray diffraction as functions of VTE treatment temperature and sapphire surface roughness, it has been found that the LiAlO2 layers show a (2 0 0) preferred orientation. The effects of the VTE treatment temperature and sapphire surface roughness on the residual stress have been studied. The results show that residual stress in γ-LiAlO2 layers varies from tension to compression with increasing VTE treatment temperature , but the thermal stress is compressive; the values of residual stress in γ-LiAlO2 layers increase with the sapphire surface roughness.

  12. Shear strength of metal-sapphire contacts

    NASA Technical Reports Server (NTRS)

    Pepper, S. V.

    1976-01-01

    The shear strength of polycrystalline Ag, Cu, Ni, and Fe contacts on clean (0001) sapphire has been studied in ultrahigh vacuum. Both clean metal surfaces and surfaces exposed to O2, Cl2, and C2H4 were used. The results indicate that there are two sources of strength of Al2O3-metal contacts: an intrinsic one that depends on the particular clean metal in contact with Al2O3 and an additional one due to intermediate films. The shear strength of the clean metal contacts correlated directly with the free energy of oxide formation for the lowest metal oxide, in accord with the hypothesis that a chemical bond is formed between metal cations and oxygen anions in the sapphire surface. Contacts formed by metals exposed to chlorine exhibited uniformly low shear strength indicative of van der Waals bonding between chlorinated metal surfaces and sapphire. Contacts formed by metals exposed to oxygen exhibited enhanced shear strength, in accord with the hypothesis that an intermediate oxide layer increases interfacial strength.

  13. Anisotropy of sapphire single crystal sputtering

    SciTech Connect

    Minnebaev, K. F.; Tolpin, K. A.; Yurasova, V. E.

    2015-08-15

    We have studied the spatial distribution of particles sputtered from the base (0001) plane of a sapphire single crystal with trigonal crystalline lattice (α-Al{sub 2}O{sub 3}) that can be considered a superposition of two hexagonal close packed (hcp) structures–the ideal sublattice of oxygen and a somewhat deformed sublattice of aluminum. It is established that the particles sputtered from the base plane of sapphire are predominantly deposited along the sides of an irregular hexagon with spots at its vertices. The patterns of spots have been also studied for sputtering of particles from the (0001) face of a zinc single crystal with the hcp lattice. The spots of sputtered Zn atoms are arranged at the vertices of concentric equilateral hexagons. In both cases, the observed anisotropy of sputtering is related to focused collisions (direct and assisted focusing) and the channeling process. The chemical composition of spots has been determined in various regions of sputtered sapphire deposition. The results are discussed in comparison to analogous earlier data for secondary ion emission from an α-Al{sub 2}O{sub 3} single crystal.

  14. Gate-controlled-diodes in silicon-on-sapphire: A computer simulation

    NASA Technical Reports Server (NTRS)

    Gassaway, J. D.

    1974-01-01

    The computer simulation of the electrical behavior of a Gate-Controlled Diode (GCD) fabricated in Silicon-On-Sapphire (SOS) was described. A procedure for determining lifetime profiles from capacitance and reverse current measurements on the GCD was established. Chapter 1 discusses the SOS structure and points out the need of lifetime profiles to assist in device design for GCD's and bipolar transistors. Chapter 2 presents the one-dimensional analytical formula for electrostatic analysis of the SOS-GCD which are useful for data interpretation and setting boundary conditions on a simplified two-dimensional analysis. Chapter 3 gives the results of a two-dimensional analysis which treats the field as one-dimensional until the silicon film is depleted and the field penetrates the sapphire substrate. Chapter 4 describes a more complete two-dimensional model and gives results of programs implementing the model.

  15. Extraordinary alignment of Nb films with sapphire and the effects of added hydrogen

    NASA Astrophysics Data System (ADS)

    Reimer, P. M.; Zabel, H.; Flynn, C. P.; Dura, J. A.

    1992-05-01

    We present the results of high-resolution x-ray scattering studies of the structural coherence of niobium [110] films grown by molecular-beam epitaxy on sapphire [112¯0] substrates. In transverse scans of the out-of-plane (110) Bragg peak we find two components, the sharper of which implies mosaicities an order of magnitudes better than bulk single-crystal Nb, and transverse structural coherence lengths exceeding 104 Å. In addition, we observe that the planes associated with the sharp component are exactly aligned with the sapphire (112¯0) planes. Upon hydrogen loading of the Nb film, we find evidence for a dramatic increase of the lateral coherence length.

  16. Structural, transport and microwave properties of 123/sapphire films: Thickness effect

    NASA Technical Reports Server (NTRS)

    Predtechensky, M. R.; Smal, A. N.; Varlamov, Yu. D.; Vatnik, S. M.; Tukhto, O. M.; Vasileva, I. G.

    1995-01-01

    The effect of thickness and growth conditions on the structure and microwave properties has been investigated for the 123/sapphire films. It has been shown that in the conditions of epitaxial growth the Al atoms do not diffuse from substrate into the film and the films with thickness up to 100 nm exhibit the excellent direct current (DC) properties. The increase of thickness of GdBaCuO films causes the formation of extended line-mesh defects and the increase of the surface resistance (R(sub S)). The low value of surface resistance R(sub S)(75 GHz, 77K) = 20 mOhm has been obtained for the two layer YBaCuO/CdBaCuO/sapphire films.

  17. Structural, transport and microwave properties of 123/sapphire films: Thickness effect

    SciTech Connect

    Predtechensky, MR.; Smal, A.N.; Varlamov, Y.D.

    1994-12-31

    The effect of thickness and growth conditions on the structure and microwave properties has been investigated for the 123/sapphire films. It has been shown that in the conditions of epitaxial growth and Al atoms do not diffuse from substrate into the film and the films with thickness up to 100nm exhibit the excellent DC properties. The increase of thickness of GdBaCuO films causes the formation of extended line-mesh defects and the increase of the surface resistance (R{sub S}). The low value of surface resistance R{sub S}(75GHz,77K)=20 mOhm has been obtained for the two layer YBaCuO/CdBaCuO/sapphire films.

  18. Spontaneous formation of GaN/AlN core-shell nanowires on sapphire by hydride vapor phase epitaxy

    NASA Astrophysics Data System (ADS)

    Trassoudaine, Agnès; Roche, Elissa; Bougerol, Catherine; André, Yamina; Avit, Geoffrey; Monier, Guillaume; Ramdani, Mohammed Réda; Gil, Evelyne; Castelluci, Dominique; Dubrovskii, Vladimir G.

    2016-11-01

    Spontaneous GaN/AlN core-shell nanowires with high crystal quality were synthesized on sapphire substrates by vapor-liquid-solid hydride vapor phase epitaxy (VLS-HVPE) without any voluntary aluminum source. Deposition of aluminum is difficult to achieve in this growth technique which uses metal-chloride gaseous precursors: the strong interaction between the AlCl gaseous molecules and the quartz reactor yields a huge parasitic nucleation on the walls of the reactor upstream the substrate. We open up an innovative method to produce GaN/AlN structures by HVPE, thanks to aluminum etching from the sapphire substrate followed by redeposition onto the sidewalls of the GaN core. The paper presents the structural characterization of GaN/AlN core-shell nanowires, speculates on the growth mechanism and discusses a model which describes this unexpected behavior.

  19. Epitaxial yttria-stabilized zirconia on (1 -1 0 2) sapphire for YBa2Cu3O(7-delta) thin films

    NASA Technical Reports Server (NTRS)

    Wu, X. D.; Muenchausen, R. E.; Nogar, N. S.; Pique, A.; Edwards, R.

    1991-01-01

    Epitaxial yttria-stabilized zirconia (YSZ) films were deposited on (1 -1 0 2) sapphire by pulsed laser deposition. The films are formed in a cubic phase with the a axis normal to the substrate surface. Ion beam channeling measurements show that the YSZ films are highly crystalline with a channeling minimum yield of 8 percent. The epitaxial relationship between the film and substrate is further confirmed by a cross-section TEM study. Epitaxial YBa2Cu3O(7-delta) thin films deposited on YSZ/sapphire have Tc and Jc of up to 89 K and 10 to the 6th A/sq cm at 77 K, respectively.

  20. Highly a-axis oriented -LiAlO2 layer on a-plane sapphire fabricated by vapor transport equilibration

    NASA Astrophysics Data System (ADS)

    Zhou, Shengming; Xu, Jun; Li, Shuzhi; Yang, Weiqiao; Zou, Jun; Peng, Guanliang; Liu, Shiliang; Wang, Yinzhen; Li, Hongjun; Zhou, Guoqing; Hang, Yin

    2004-05-01

    A single-phase -LiAlO2 layer with a highly-preferred (100) orientation on sapphire substrate is successfully fabricated by vapor transport equilibration (VTE) technique in Li-rich ambient. The VTE treatment temperature is essential to obtaining the high-quality layer of -LiAlO2, and the optimized temperature is about 1050 °C in the present work. It is promising to fabricate the -LIAlO2(100)//sapphire composite substrate for GaN-based epitaxial film.

  1. Surface resistance measurements of surface and interface sides of YBa2Cu3O7 films on sapphire and LaAlO3

    NASA Astrophysics Data System (ADS)

    Jacob, Mohan V.; Mazierska, Janina; Lorenz, Michael

    2003-03-01

    We have measured the surface resistance of YBCO superconducting thin films deposited on sapphire and lanthanum aluminate substrates at the film side and at the interface between the substrate and the film. The measured difference in the Rs values of the interface and the film sides was between 30% and 60% for the YBCO films on LAO in the temperature range 15-80 K. For the Ag-doped films on sapphire the difference in Rs monotonically varied from 10% to 65% when temperature increased from 30 K to 80 K.

  2. Study of the crystal structure of silicon nanoislands on sapphire

    SciTech Connect

    Krivulin, N. O. Pirogov, A. V.; Pavlov, D. A.; Bobrov, A. I.

    2015-02-15

    The results of studies of the crystal structure of silicon nanoislands on sapphire are reported. It is shown that the principal defects in silicon nanoislands on sapphire are twinning defects. As a result of the formation of such defects, different crystallographic orientations are formed in silicon nanoislands on sapphire. In the initial stages of the molecular-beam epitaxy of silicon on sapphire, there are two basic orientations: the (001) orientation parallel to the surface and the (001) orientation at an angle of 70° to the surface.

  3. Photonic detection and characterization of DNA using sapphire microspheres

    NASA Astrophysics Data System (ADS)

    Murib, Mohammed Sharif; Yeap, Weng-Siang; Martens, Daan; Bienstman, Peter; De Ceuninck, Ward; van Grinsven, Bart; Schöning, Michael J.; Michiels, Luc; Haenen, Ken; Ameloot, Marcel; Serpengüzel, Ali; Wagner, Patrick

    2014-09-01

    A microcavity-based deoxyribonucleic acid (DNA) optical biosensor is demonstrated for the first time using synthetic sapphire for the optical cavity. Transmitted and elastic scattering intensity at 1510 nm are analyzed from a sapphire microsphere (radius 500 μm, refractive index 1.77) on an optical fiber half coupler. The 0.43 nm angular mode spacing of the resonances correlates well with the optical size of the sapphire sphere. Probe DNA consisting of a 36-mer fragment was covalently immobilized on a sapphire microsphere and hybridized with a 29-mer target DNA. Whispering gallery modes (WGMs) were monitored before the sapphire was functionalized with DNA and after it was functionalized with single-stranded DNA (ssDNA) and double-stranded DNA (dsDNA). The shift in WGMs from the surface modification with DNA was measured and correlated well with the estimated thickness of the add-on DNA layer. It is shown that ssDNA is more uniformly oriented on the sapphire surface than dsDNA. In addition, it is shown that functionalization of the sapphire spherical surface with DNA does not affect the quality factor (Q≈104) of the sapphire microspheres. The use of sapphire is especially interesting because this material is chemically resilient, biocompatible, and widely used for medical implants.

  4. Leveraging Python Interoperability Tools to Improve Sapphire's Usability

    SciTech Connect

    Gezahegne, A; Love, N S

    2007-12-10

    The Sapphire project at the Center for Applied Scientific Computing (CASC) develops and applies an extensive set of data mining algorithms for the analysis of large data sets. Sapphire's algorithms are currently available as a set of C++ libraries. However many users prefer higher level scripting languages such as Python for their ease of use and flexibility. In this report, we evaluate four interoperability tools for the purpose of wrapping Sapphire's core functionality with Python. Exposing Sapphire's functionality through a Python interface would increase its usability and connect its algorithms to existing Python tools.

  5. Sapphire-fiber-based intrinsic Fabry-Perot interferometer

    NASA Technical Reports Server (NTRS)

    Wang, Anbo; Gollapudi, Sridhar; Murphy, Kent A.; May, Russell G.; Claus, Richard O.

    1992-01-01

    A sapphire optical fiber intrinsic Fabry-Perot interferometric sensor is demonstrated. A length of multimode sapphire fiber that functions as a Fabry-Perot cavity is spliced to a silica single-mode fiber. The interferometric signals of this sensor are produced by the interference between the reflection from the silica-sapphire fiber splice and the reflection from the free end face of the sapphire fiber. This sensor has been demonstrated for temperature measurement. A resolution of 0.2 C has been obtained over a measurement range of 310 C to 976 C.

  6. Fabrication of GaN Microporous Structure at a GaN/Sapphire Interface as the Template for Thick-Film GaN Separation Grown by HVPE

    NASA Astrophysics Data System (ADS)

    Chen, Jianli; Cheng, Hongjuan; Zhang, Song; Lan, Feifei; Qi, Chengjun; Xu, Yongkuan; Wang, Zaien; Li, Jing; Lai, Zhanping

    2016-10-01

    In this paper, a microporous structure at the GaN/sapphire interface has been obtained by an electrochemical etching method via a selective etching progress using an as-grown GaN/sapphire wafer grown by metal organic chemical vapor deposition. The as-prepared GaN interfacial microporous structure has been used as a template for the following growth of thick-film GaN crystal by hydride vapor phase epitaxy (HVPE), facilitating the fabrication of a free-standing GaN substrate detached from a sapphire substrate. The evolution of the interfacial microporous structure has been investigated by varying the etching voltages and time, and the formation mechanism of interfacial microporous structure has been discussed in detail as well. Appropriate interfacial microporous structure is beneficial for separating the thick GaN crystal grown by HVPE from sapphire during the cooling down process. The separation that occurred at the place of interfacial microporous can be attributed to the large thermal strain between GaN and sapphire. This work realized the fabrication of a free-standing GaN substrate with high crystal quality and nearly no residual strain.

  7. Description of Project Sapphire. Revision 1

    SciTech Connect

    Taylor, R.G.

    1995-06-06

    The mission of Project Sapphire was to repackage approximately 600 kg of highly enriched uranium (HEU) in the Republic of Kazakhstan into internationally acceptable shipping packages and transport the material to a storage location in the United States. There were four material types to be repackaged: metal; oxide; uranium/beryllium (U/Be) alloy; and residues from U/Be alloy production. Seven major steps described in this report were necessary for successful execution of the project: planning and training; readiness assessment; deployment; set up; process; take down; and transport. Nuclear criticality safety especially affected several of these steps.

  8. Mode Orientation Control For Sapphire Dielectric Ring Resonator

    NASA Technical Reports Server (NTRS)

    Santiago, David G.; Dick, G. John; Prata, Aluizio

    1996-01-01

    Small sapphire tuning wedge used in technique for solving mode-purity problem associated with sapphire dielectric-ring resonator part of cryogenic microwave frequency discriminator. Breaks quasi-degeneracy of two modes and allows selective coupling to just one mode. Wedge mounted on axle entering resonator cavity and rotated while resonator cryogenically operating in vacuum. Furthermore, axle moved vertically to tune resonant frequency.

  9. On-Orbit Results for Canada's Sapphire Optical Payload

    NASA Astrophysics Data System (ADS)

    Scott, A.; Hackett, J.

    2013-09-01

    Sapphire is the first Space Situational Awareness (SSA) satellite mission flown by Canada's Department of National Defence (DND). On February 25, 2013 Sapphire was successfully launched into a sun synchronous orbit at ~786 km altitude. The commissioning phase was a success and the Sapphire system is entering its operational phase. Canada and the United States signed an SSA Memorandum of Understanding on May 4, 2012. Under the agreement, data from DND's Sapphire satellite will be contributed to the U.S. Space Surveillance Network (SSN), enhancing the ability of both countries to detect and avoid the collision of critical space platforms with orbital debris. The Sapphire system is now collecting SSA data that will be shared with the SSN. This SSA partnership will strengthen the long standing defence relationship between the US and Canada and provide diversity in space based sensors at a time of fiscal constraint. The Sapphire satellite optical imaging payload was designed and built by COM DEV based around a small (13.25 cm) Three Mirror Anastigmat (TMA) telescope similar in design to the Space Based Visible sensor on the US Mid-Course Space Experiment satellite. The paper provides an overview of the design and operational performance of the Sapphire instrument, comparing the actual performance to the requirements. Based on lessons learned on this program we discuss potential improvements that would be feasible in a second generation Sapphire payload including the potential for using this sensor as a hosted payload in other applications.

  10. Defect formation and recrystallization in the silicon on sapphire films under Si+ irradiation

    NASA Astrophysics Data System (ADS)

    Shemukhin, A. A.; Nazarov, A. V.; Balakshin, Yu. V.; Chernysh, V. S.

    2015-07-01

    Silicon-on-sapphire (SOS) is one of the most promising silicon-on-insulator (SOI) technologies. SOS structures are widely used in microelectronics, but to meet modern requirements the silicon layer should be 100 nm thick or less. The problem is in amount of damage in the interface layer, which decreases the quality of the produced devices. In order to improve the crystalline structure quality SOS samples with 300 nm silicon layers were implanted with Si+ ions with energies in the range from 180 up to 230 keV with fluences in the range from 1014 up to 5 × 1015 cm-2 at 0 °C. The crystalline structure of the samples was studied with RBS and the interface layer was studied with SIMS after subsequent annealing. It has been found out that to obtain silicon films with high lattice quality it is necessary to damage the sapphire lattice near the silicon-sapphire interface. Complete destruction of the strongly defected area and subsequent recrystallization depends on the energy of implanted ions and the substrate temperature. No significant mixing in the interface layer was observed with the SIMS.

  11. Double Sided Si(Ge)/Sapphire/III-Nitride Hybrid Structure

    NASA Technical Reports Server (NTRS)

    Park, Yeonjoon (Inventor); Choi, Sang Hyouk (Inventor)

    2016-01-01

    One aspect of the present invention is a double sided hybrid crystal structure including a trigonal Sapphire wafer containing a (0001) C-plane and having front and rear sides. The Sapphire wafer is substantially transparent to light in the visible and infrared spectra, and also provides insulation with respect to electromagnetic radio frequency noise. A layer of crystalline Si material having a cubic diamond structure aligned with the cubic <111> direction on the (0001) C-plane and strained as rhombohedron to thereby enable continuous integration of a selected (SiGe) device onto the rear side of the Sapphire wafer. The double sided hybrid crystal structure further includes an integrated III-Nitride crystalline layer on the front side of the Sapphire wafer that enables continuous integration of a selected III-Nitride device on the front side of the Sapphire wafer.

  12. Proton and neutron irradiation effect of Ti: Sapphires

    SciTech Connect

    Wang, G.; Zhang, J.; Yang, J.

    1999-07-01

    Various effects of proton and neutron irradiated Ti: sapphires were studied. Proton irradiation induced F, F{sup +} and V center in Ti: sapphires and 3310 cm{sup -1} infrared absorption, and made ultraviolet absorption edge shift to short wave. Neutron irradiation produced a number of F, F{sup +} and F{sub 2} centers and larger defects in Ti: sapphires, and changed Ti{sup 4+}into Ti{sup 3+} ions. Such valence state variation enhanced characteristic luminescence of Ti: sapphires, and no singular variances of intrinsic fluorescence spectra of Ti: sapphires took place with neutron flux of 1 x 10{sup 17}n/cm{sup 2}, but the fluorescence vanished with neutron flux of 1 x 10{sup 18}n/cm{sup 2} which means the threshold for the concentration of improving Ti{sup 3+} ions by neutron irradiation.

  13. Ion beam mixing of Fe with sapphire and silica

    SciTech Connect

    Sinha, S. K.; Vigen, K. M.; Kothari, D. C.; Som, T.; Kulkarni, V. N.; Nair, K. G. M.

    1999-06-10

    We have studied ion beam mixing of Fe with sapphire, silica, Al and Si using different mass of the ions (Ne{sup +},Ar{sup +}), different doses (5x10{sup 15} to 2x10{sup 17} ions/cm{sup 2}) and different temperatures (273 deg. K, 423 deg. K and 573 deg. K). Thin film of Fe was deposited by thermal evaporation method. Ion energy was chosen from 30 to 110 keV so that F{sub d} is maximum at the interface. All the specimens were analyzed by RBS. It is found that the square of the diffusion length Dt is proportional to the ion dose for both types of the substrates (Al{sub 2}O{sub 3} and SiO{sub 2}) implying that mixing is due to the ballistic effect (i.e. cascade mixing). Also mixing is more when irradiated by Ar{sup +} ions than Ne{sup +} ions. Comparison of Dt's shows that mixing is less in ceramics than in pure-elements Al and Si. In Fe-Al{sub 2}O{sub 3} samples, mixing decreases with increase in irradiation temperatures implying de-mixing in crystalline ionic bonded oxide whereas mixing increases in the covalently bonded oxide SiO{sub 2}. Irradiated annealed samples of Fe/Al{sub 2}O{sub 3} and Fe/SiO{sub 2} show de-mixing and mixing respectively.

  14. Electron Beam Welder Used to Braze Sapphire to Platinum

    NASA Technical Reports Server (NTRS)

    Forsgren, Roger C.; Vannuyen, Thomas

    1998-01-01

    A new use for electron beam brazing was recently developed by NASA Lewis Research Center's Manufacturing Engineering Division. This work was done to fabricate a fiberoptic probe (developed by Sentec Corporation) that could measure high temperatures less than 600 deg C of vibrating machinery, such as in jet engine combustion research. Under normal circumstances, a sapphire fiber would be attached to platinum by a ceramic epoxy. However, no epoxies can adhere ceramic fibers to platinum under such high temperatures and vibration. Also, since sapphire and platinum have different thermal properties, the epoxy bond is subjected to creep over time. Therefore, a new method had to be developed that would permanently and reliably attach a sapphire fiber to platinum. Brazing a sapphire fiber to a platinum shell. The fiber-optic probe assembly consists of a 0.015-in.-diameter sapphire fiber attached to a 0.25-in.-long, 0.059-in.-diameter platinum shell. Because of the small size of this assembly, electron beam brazing was chosen instead of conventional vacuum brazing. The advantage of the electron beam is that it can generate a localized heat source in a vacuum. Gold reactive braze was used to join the sapphire fiber and the platinum. Consequently, the sapphire fiber was not affected by the total heat needed to braze the components together.

  15. Adsorption and desorption studies of cesium on sapphire surfaces

    SciTech Connect

    Zavadil, K.R.; Ing, J.L.

    1993-12-01

    Adsorption/desorption were studied using combined surface analytical techniques. An approximate initial sticking coefficient for Cs on sapphire was measured using reflection mass spectrometry and found to be 0.9. Thermal Desorption Mass Spectrometry (TDMS) and Auger Electron Spectroscopy (AES) were used to verify that a significant decrease in sticking coefficient occurs as the Cs coverage reaches a critical submonolayer value. TDMS analysis demonstrates that Cs is stabilized on a clean sapphire surface at temperatures (1200 K) in excess of the temperatures experienced by sapphire in a TOPAZ-2 thermionic fuel element (TFE). Surface contaminants on sapphire can enhance Cs adsorption relative to the clean surface. C contamination eliminates the high temperature state of Cs desorption found on clean sapphire but shifts the bulk of the C desorption from 400 to 620 K. Surface C is a difficult contaminant to remove from sapphire, requiring annealing above 1400 K. Whether Cs is stabilized on sapphire in a TFE environment will most likely depend on relation between surface contamination and surface structure.

  16. Impact of high-temperature annealing of AlN layer on sapphire and its thermodynamic principle

    NASA Astrophysics Data System (ADS)

    Fukuyama, Hiroyuki; Miyake, Hideto; Nishio, Gou; Suzuki, Shuhei; Hiramatsu, Kazumasa

    2016-05-01

    The N2-CO gas annealing technique was demonstrated to improve the crystalline quality of the AlN layer on sapphire. 300-nm-thick AlN layers were fabricated on sapphire substrates by a metal-organic vapor phase epitaxy method. The AlN layers were annealed in N2 and/or N2-CO gas atmosphere at 1923-1973 K for 0.5-4 h. Many pits and voids were observed on the AlN surface annealed in N2 atmosphere at 1973 K for 2 h. The rough surface was, however, much improved for the AlN annealed in N2-CO gas atmosphere. The thermodynamic principle of the N2-CO gas annealing technique is explained in this paper on the basis of the phase stability diagram of the Al2O3-AlN-C-N2-CO system. Voids and γ-aluminum oxynitride (γ-AlON) at the AlN/sapphire interface formed during the annealing, which is also explained on the basis of the phase stability diagram. The in-plane epitaxial relationships among AlN, γ-AlON, and sapphire are presented, and misfits among them are discussed.

  17. The study on the nanomachining property and cutting model of single-crystal sapphire by atomic force microscopy.

    PubMed

    Huang, Jen-Ching; Weng, Yung-Jin

    2014-01-01

    This study focused on the nanomachining property and cutting model of single-crystal sapphire during nanomachining. The coated diamond probe is used to as a tool, and the atomic force microscopy (AFM) is as an experimental platform for nanomachining. To understand the effect of normal force on single-crystal sapphire machining, this study tested nano-line machining and nano-rectangular pattern machining at different normal force. In nano-line machining test, the experimental results showed that the normal force increased, the groove depth from nano-line machining also increased. And the trend is logarithmic type. In nano-rectangular pattern machining test, it is found when the normal force increases, the groove depth also increased, but rather the accumulation of small chips. This paper combined the blew by air blower, the cleaning by ultrasonic cleaning machine and using contact mode probe to scan the surface topology after nanomaching, and proposed the "criterion of nanomachining cutting model," in order to determine the cutting model of single-crystal sapphire in the nanomachining is ductile regime cutting model or brittle regime cutting model. After analysis, the single-crystal sapphire substrate is processed in small normal force during nano-linear machining; its cutting modes are ductile regime cutting model. In the nano-rectangular pattern machining, due to the impact of machined zones overlap, the cutting mode is converted into a brittle regime cutting model.

  18. Ruby and sapphire from Jegdalek, Afghanistan

    USGS Publications Warehouse

    Bowersox, G.W.; Foord, E.E.; Laurs, B.M.; Shigley, J.E.; Smith, C.P.

    2000-01-01

    This study provides detailed mining and gemological information on the Jegdalek deposit, in east-central Afghanistan, which is hosted by elongate beds of corundum-bearing marble. Some facet-grade ruby has been recovered, but most of the material consists of semitransparent pink sapphire of cabochon or carving quality. The most common internal features are dense concentrations of healed and nonhealed fracture planes and lamellar twin planes. Color zoning is common, and calcite, apatite, zircon, mica, iron sulfide minerals, graphite, rutile, aluminum hydroxide, and other minerals are also present in some samples. Although the reserves appear to be large, future potential will depend on the establishment of a stable government and the introduction of modern mining and exploration techniques. ?? 2000 Gemological Institute of America.

  19. Fe-sapphire and C-Fe-sapphire interactions and their effect on the growth of single-walled carbon nanotubes by chemical vapor deposition.

    PubMed

    Yudasaka, M; Kasuya, Y; Jing, F; Zhang, M; Iijima, S

    2004-04-01

    We previously reported that the quantity of single-walled carbon nanotubes grown on Fe-coated sapphire by chemical vapor deposition depended on the crystallographic faces of sapphires. In this report, we show that the interaction of Fe, sapphire, and carbon depended on the sapphire faces. We deduce that the quantity of Fe available to catalyze the growth of single-walled carbon nanotubes was suppressed by the formation of Fe-Al alloys and whether the Fe-Al alloys were formed on Fe-coated sapphire or not depended on the sapphire-surface structure. PMID:15296233

  20. Fe-sapphire and C-Fe-sapphire interactions and their effect on the growth of single-walled carbon nanotubes by chemical vapor deposition.

    PubMed

    Yudasaka, M; Kasuya, Y; Jing, F; Zhang, M; Iijima, S

    2004-04-01

    We previously reported that the quantity of single-walled carbon nanotubes grown on Fe-coated sapphire by chemical vapor deposition depended on the crystallographic faces of sapphires. In this report, we show that the interaction of Fe, sapphire, and carbon depended on the sapphire faces. We deduce that the quantity of Fe available to catalyze the growth of single-walled carbon nanotubes was suppressed by the formation of Fe-Al alloys and whether the Fe-Al alloys were formed on Fe-coated sapphire or not depended on the sapphire-surface structure.

  1. Sapphire fiber interferometer for microdisplacement measurements at high temperatures

    NASA Technical Reports Server (NTRS)

    Murphy, Kent A.; Fogg, Brian R.; Wang, George Z.; Vengsarkar, Ashish M.; Claus, Richard O.

    1991-01-01

    We report the use of a short-length, multimode sapphire rod as an extension to a Michelson configuration, but operated as a low-finesse Fabry-Perot cavity. We demonstrate the performance of such a device as an interferometric sensor, where the interference between the reflections from the sapphire-air interface and an air-metallic surface is observed for microdisplacement of the metallic surface which is placed close to the sapphire endface. We describe in detail the fabrication procedure and present results obtained from the detection of temperature changes, applied strain, and surface acoustic waves.

  2. Temperature Compensated Sapphire Resonator for Ultra-Stable Oscillator Capability

    NASA Technical Reports Server (NTRS)

    Dick, G. J.; Santiago, D. G.; Wang, R. T.

    1994-01-01

    We report on the design and test of a whispering gallery sapphire resonator for which the dominant microwave mode family shows frequency-stable, compensated operation for temperatures above 77 kelvin.

  3. A high sensitivity sapphire transducer for vibration measurements

    SciTech Connect

    Peng, H.; Blair, D.G.; Ivanov, E.

    1994-12-31

    In this report we describe an interferometric Sapphire Dielectric Resonator (SDR) transducer which avoids the need for an ultra low noise oscillator. An initial performance of the transducer is presented.

  4. Second generation 50 K dual-mode sapphire oscillator.

    PubMed

    Anstie, James D; Hartnett, John G; Tobar, Michael E; Ivanov, Eugene N; Stanwix, Paul L

    2006-02-01

    Low-temperature, high-precision sapphire resonators exhibit a turning point in mode frequency-temperature dependence at around 10 K. This, along with sapphire's extremely low dielectric losses at microwave frequencies, results in oscillator fractional frequency stabilities on the order of 10(-15). At higher temperatures the lack of a turning point makes single-mode oscillators very sensitive to temperature fluctuations. By exciting two quasi-orthogonal whispering gallery (WG) modes in a single sapphire resonator, a turning point in the frequency-temperature dependence can be found in the beat frequency between the two modes. A temperature control technique based on mode frequency temperature dependence has been used to maintain the sapphire at this turning point and the fractional frequency instability of the beat frequency has been measured to be at a level of 4.3 X 10(-14) over 1 s, dropping to 3.5 X 10(-14) over 4 s integration time.

  5. Defect Analysis of Boron Phosphide Thin Films and Sapphire Single Crystal Using Synchrotron X-ray Topography

    NASA Astrophysics Data System (ADS)

    Ding, Zihao

    Boron phosphide is an ideal semiconductor material used for neutron detectors because of its superior material properties, such as wide band gap and large thermal neutron capture cross-section of 10B. Since bulk BP is not readily available for neutron detector application, BP thin films are mainly synthesized by chemical vapor deposition (CVD). Among all the feasible substrates for BP deposition, SiC stands out due to its small lattice mismatch (4.5%) with BP, however it is necessary to optimize the growth condition to synthesize high quality BP thin films on SiC. In chapter III, BP thin film samples deposited on 4H-SiC and 6H-SiC under different growth conditions are characterized, mainly using synchrotron X-ray topography and other techniques such as optical microscopy and scanning electron microscopy. The relationship between BP thin film crystal quality and substrate material and orientation and other growth conditions is investigated. It can be concluded from the experimental data that the crystal quality of BP thin films on 4H-SiC substrate is much better than that on 6H-SiC substrate. Besides, poor crystalline quality of substrate will likely degrade the crystalline quality of epitaxial thin films. Sapphire single crystal has been widely used in high-technology industry because of its excellent combination between optical, electrical and mechanical properties. In this thesis, a-plane sapphire ribbon grown by Edge-defined Film-fed Growth method (EFG) is analyzed by characterizing the seed crystals used and the quality of as-grown ribbon, by reflection X-ray topography. Distributions and formation mechanisms of defects inside both the sapphire seed crystal and ribbon crystal are studied. Transmission topographs reveal the presence of two sets of slip bands that are nucleated from either edge, the distribution of which is symmetric in the used seed crystal and asymmetric in the pristine seed crystal. This phenomenon could be caused by the unstable growth

  6. Progress on 10 Kelvin cryo-cooled sapphire oscillator

    NASA Technical Reports Server (NTRS)

    Wang, Rabi T.; Dick, G. John; Diener, William A.

    2004-01-01

    We present recent progress on the 10 Kelvin Cryocooled Sapphire Oscillator (10K CSO). Included are incorporation of a new pulse tube cryocooler, cryocooler vibration comparisons between G-M and pulse-tube types, phase noise, and frequency stability tests. For the advantage of a single stage pulse tube cryocooler, we also present results for a 40K Compensated Sapphire Oscillator (40K CSO).

  7. Structural and Electronic Properties of GaN Films Grown on Sapphire.

    NASA Astrophysics Data System (ADS)

    Zhu, Q.; Botchkarev, A.; Kim, W.; Aktas, O.; Salvador, A.; Sverdlov, B.; Morkoc, H.; Tsen, S.-C. Y.; Smith, D. J.

    1996-03-01

    The structural characteristics of GaN films grown on sapphire substrates by molecular beam epitaxy (MBE) have been investigated using high-resolution synchrotron x-ray diffraction and electron microscopy, and compared to their electrical and optical properties. We find remarkable correspondence between the in-plane structural order (coherence length and mosaic spread) and the electrical and optical properties. Contrary to common belief, our observations show unequivocally that the out-of-plane structural features, which are considerably better developed than the in-plane counterparts, can not be used for determining the material quality with respect to their optical and electrical activity. In particular, the (00l) mosaic spread is not a good indicator of film quality. The structural correlations of the GaN film, the AlN buffer laryer and the sapphire substrate are also explored and compared to their growth conditions. The issue of in-plane stacking fault (hcp - fcc) is also addressed using x-ray scans along the (10l) direction. Work supported by the US Department of Energy, Division of Materials Science under contract No. DEAC0276CH00016, by NSF Grant DMR-9314326, by the Office of Naval Research with M. Yoder and Dr. Y. S. Park as monitors, and by the Air Force Office of Scientific Research with Dr. G. L. Witt as the monitor. H. M. was funded by AFOSR under a URRP program.

  8. SINGLE-CRYSTAL SAPPHIRE OPTICAL FIBER SENSOR INSTRUMENTATION

    SciTech Connect

    A. Wang; G. Pickrell; R. May

    2002-09-10

    In this research program, several optical instruments for high temperature measurement based on single crystal sapphire material are introduced and tested for real-time, reliable, long-term monitoring of temperatures for coal gasifier. These are sapphire fiber extrinsic Fabry-Perot interferometric (EFPI) sensor; intensity-measurement based polarimetric sapphire sensor and broadband polarimetric differential interferometric (BPDI) sapphire sensor. Based on current evaluation and analysis of the experimental results, the broadband polarimetric differential interferometric (BPDI) sensor system was chosen for further prototype instrumentation development. This approach is based on the self-calibrating measurement of optical path differences (OPD) in a single-crystal sapphire disk, which is a function of both the temperature dependent birefringence and the temperature dependent dimensional changes. The BPDI sensor system extracts absolute temperature information by absolute measurement of phase delays. By encoding temperature information in optical spectrum instead of optical intensity, this sensor guarantees its relative immunity to optical source power fluctuations and fiber losses, thus providing a high degree of long-term measurement stability which is highly desired in industrial applications. The entire prototype for BPDI system including the single crystal sapphire probe, zirconia prism, alumina extension tube, optical components and signal processing hardware and software have shown excellent performance in the laboratory experiments shown in this report.

  9. Structural and optical properties of low temperature grown AlN films on sapphire using helicon sputtering system

    SciTech Connect

    Chen, Meei-Ru; Chen, Hou-Guang; Kao, Hui-Ling Wu, Ming-Guei; Tzou, An-Jye; Chen, Jyh Shin; Chou, Hsiung

    2015-05-15

    AlN thin films have been deposited directly on c-plane sapphire substrates at low temperatures by a helicon sputtering system. The structural quality of AlN epitaxial films was characterized by x-ray diffractometry and transmission electron microscopy. The films exhibit smooth surface with root-mean-square roughness as small as 0.7 nm evaluated by atomic force microscope. The optical transmittance spectra show a steep absorption edge at the wavelength of 200 nm and a high transmittance of over 80% in the visible range. The band-edge transition (6.30 eV) of AlN film was observed in the cathodoluminescence spectrum recorded at 11 K. The spectral response of metal–semiconductor–metal photodetectors constructed with AlN/sapphire reveals the peak responsivity at 200 nm and a UV/visible rejection ratio of about two orders of magnitude. The results of this low temperature deposition suggest the feasibility of the epitaxial growth of AlN on sapphire substrates and the incorporation of the AlN films in the surface acoustic wave devices and the optical devices at deep ultraviolet region.

  10. Cryogenic Pound Circuits for Cryogenic Sapphire Oscillators

    NASA Technical Reports Server (NTRS)

    Dick, G. John; Wang, Rabi

    2006-01-01

    Two modern cryogenic variants of the Pound circuit have been devised to increase the frequency stability of microwave oscillators that include cryogenic sapphire-filled cavity resonators. The original Pound circuit is a microwave frequency discriminator that provides feedback to stabilize a voltage-controlled microwave oscillator with respect to an associated cavity resonator. In the present cryogenic Pound circuits, the active microwave devices are implemented by use of state-of-the-art commercially available tunnel diodes that exhibit low flicker noise (required for high frequency stability) and function well at low temperatures and at frequencies up to several tens of gigahertz. While tunnel diodes are inherently operable as amplitude detectors and amplitude modulators, they cannot, by themselves, induce significant phase modulation. Therefore, each of the present cryogenic Pound circuits includes passive circuitry that transforms the AM into the required PM. Each circuit also contains an AM detector that is used to sample the microwave signal at the input terminal of the high-Q resonator for the purpose of verifying the desired AM null at this point. Finally, each circuit contains a Pound signal detector that puts out a signal, at the modulation frequency, having an amplitude proportional to the frequency error in the input signal. High frequency stability is obtained by processing this output signal into feedback to a voltage-controlled oscillator to continuously correct the frequency error in the input signal.

  11. A peek into the history of sapphire crystal growth

    NASA Astrophysics Data System (ADS)

    Harris, Daniel C.

    2003-09-01

    After the chemical compositions of sapphire and ruby were unraveled in the middle of the 19th century, chemists set out to grow artificial crystals of these valuable gemstones. In 1885 a dealer in Geneva began to sell ruby that is now believed to have been created by flame fusion. Gemnologists rapidly concluded that the stones were artificial, but the Geneva ruby stimulated A. V. L. Verneuil in Paris to develop a flame fusion process to produce higher quality ruby and sapphire. By 1900 there was brisk demand for ruby manufactured by Verneuil's method, even though Verneuil did not publicly announce his work until 1902 and did not publish details until 1904. The Verneuil process was used with little alteration for the next 50 years. From 1932-1953, S. K. Popov in the Soviet Union established a capability for manufacturing high quality sapphire by the Verneuil process. In the U.S., under government contract, Linde Air Products Co. implemented the Verneuil process for ruby and sapphire when European sources were cut off during World War II. These materials were essential to the war effort for jewel bearings in precision instruments. In the 1960s and 1970s, the Czochralski process was implemented by Linde and its successor, Union Carbide, to make higher crystal quality material for ruby lasers. Stimulated by a government contract for structural fibers in 1966, H. LaBelle invented edge-defined film-fed growth (EFG). The Saphikon company, which is currently owned by Saint-Gobain, evolved from this effort. Independently and simultaneously, Stepanov developed edge-defined film-fed growth in the Soviet Union. In 1967 F. Schmid and D. Viechnicki at the Army Materials Research Lab grew sapphire by the heat exchanger method (HEM). Schmid went on to establish Crystal Systems, Inc. around this technology. Rotem Industries, founded in Israel in 1969, perfected the growth of sapphire hemispheres and near-net-shape domes by gradient solidification. In the U.S., growth of near

  12. Size and shape dependence of CO adsorption sites on sapphire supported Fe microcrystals

    NASA Technical Reports Server (NTRS)

    Papageorgopoulos, C.; Heinemann, K.

    1985-01-01

    The surface structure and stoichiometry of alumina substrates, as well as the size, growth characteristics, and shape of Fe deposits on sapphire substrates have been investigated by low energy electron diffraction (LEED), Auger electron spectroscopy, electron energy loss spectroscopy, and X-ray photoemission spectroscopy (XPS), as well as work function measurements, in conjunction with transition electron microscopy observations. The substrates used in this work were the following: (1) new, clean Al2O3; (2) same surface amorphized by Ar ion bombardment; (3) same surface regenerated by 650 C annealing; (4) amorphous alumina films on Ta slab; and (5) polycrystal alumina films, obtained by heating amorphous films to 600 C. Substrate cleaning was found to be most effective in producing a reproducible surface upon oxygen RF plasma treatment. The Fe nucleation and growth process was found to depend strongly on the type of substrate surface and deposition conditions. Ar ion bombardment under beam flooding, and subsequent annealing at 650 C was found an effective means to restore the original Al2O3 (1102) surface for renewed Fe deposition.

  13. Sapphire Fiber Optics Sensors for Engine Test Instrumentation

    SciTech Connect

    Janney, MA

    2003-09-19

    This document is the final report for the Cooperative Research and Development Agreement (CRADA) between UT-Battelle and Prime Photonics, Inc. The purpose of this CRADA was to improve the properties of single crystal sapphire optical fibers for sensor applications. A reactive coating process was developed to form a magnesium aluminate spinel cladding on sapphire optical fibers. The resulting clad fiber had a numerical aperture, NA, of 0.09 as compared with 0.83 for the unclad fiber, dramatically enhancing its usefulness for sensor applications. Because the process allows one to control the diameter of the sapphire core within the fiber, it may be possible using this technology to develop waveguides that approach single-mode transmission character.

  14. Voltage-Controlled Sapphire Oscillator: Design, Development, and Preliminary Performance

    NASA Astrophysics Data System (ADS)

    Wang, R. T.; Dick, G. J.; Tjoelker, R. L.

    2007-08-01

    We present the design for a new short-term frequency standard, the voltage-controlled sapphire oscillator, as a practical and lower-cost alternative to a cryogenic sapphire oscillator operating at liquid helium temperatures. Performance goals are a frequency stability of 1 x 10^-14 (1 second equal to or less than tau equal to or less than 100 seconds), more than 2 years of continuous operation, and practical operability. Key elements include the sapphire resonator, low-power and long-life cryocooler, frequency compensation method, and cryo-Pound design. We report the design verification, experimental results, and test results of the cryocooler environmental sensitivity, as well as a preliminary stability measurement.

  15. Spherical-sapphire-based whispering gallery mode resonator thermometer

    NASA Astrophysics Data System (ADS)

    Yu, Lili; Fernicola, V.

    2012-09-01

    A novel microwave whispering gallery mode (WGM) resonator based on a spherical sapphire crystal was developed at INRIM and its use as a thermometer was tested. The temperature dependence of the WGM frequencies was studied and the most promising resonance near to 13.6 GHz, with a loaded quality factor as large as 82 000, was carefully investigated. Its potential use in thermometry was evaluated through a study of its main metrological characteristics, such as the temperature sensitivity, the frequency stability, the repeatability, and the resolution at several temperatures over the temperature range -40 °C to 85 °C. Finally, the INRIM spherical sapphire thermometer was compared with the NIST SWGT, a dielectric thermometer based on a cylindrical sapphire resonator [V. B. Braginsky, V. S. Ilchenko, and Kh. S. Bagdassarov, Phys. Lett. A 120(3), 300 (1987), 10.1016/0375-9601(87)90676-1].

  16. A microfabricated sun sensor using GaN-on-sapphire ultraviolet photodetector arrays

    NASA Astrophysics Data System (ADS)

    Miller, Ruth A.; So, Hongyun; Chiamori, Heather C.; Suria, Ateeq J.; Chapin, Caitlin A.; Senesky, Debbie G.

    2016-09-01

    A miniature sensor for detecting the orientation of incident ultraviolet light was microfabricated using gallium nitride (GaN)-on-sapphire substrates and semi-transparent interdigitated gold electrodes for sun sensing applications. The individual metal-semiconductor-metal photodetector elements were shown to have a stable and repeatable response with a high sensitivity (photocurrent-to-dark current ratio (PDCR) = 2.4 at -1 V bias) and a high responsivity (3200 A/W at -1 V bias) under ultraviolet (365 nm) illumination. The 3 × 3 GaN-on-sapphire ultraviolet photodetector array was integrated with a gold aperture to realize a miniature sun sensor (1.35 mm × 1.35 mm) capable of determining incident light angles with a ±45° field of view. Using a simple comparative figure of merit algorithm, measurement of incident light angles of 0° and 45° was quantitatively and qualitatively (visually) demonstrated by the sun sensor, supporting the use of GaN-based sun sensors for orientation, navigation, and tracking of the sun within the harsh environment of space.

  17. Sapphire-fiber-based distributed high-temperature sensing system.

    PubMed

    Liu, Bo; Yu, Zhihao; Hill, Cary; Cheng, Yujie; Homa, Daniel; Pickrell, Gary; Wang, Anbo

    2016-09-15

    We present, for the first time to our knowledge, a sapphire-fiber-based distributed high-temperature sensing system based on a Raman distributed sensing technique. High peak power laser pulses at 532 nm were coupled into the sapphire fiber to generate the Raman signal. The returned Raman Stokes and anti-Stokes signals were measured in the time domain to determine the temperature distribution along the fiber. The sensor was demonstrated from room temperature up to 1200°C in which the average standard deviation is about 3.7°C and a spatial resolution of about 14 cm was achieved. PMID:27628409

  18. Molecular-orbital model for metal-sapphire interfacial strength

    NASA Technical Reports Server (NTRS)

    Johnson, K. H.; Pepper, S. V.

    1982-01-01

    Self-consistent-field X-Alpha scattered-wave cluster molecular-orbital models have been constructed for transition and noble metals (Fe, Ni, Cu, and Ag) in contact with a sapphire (Al2O3) surface. It is found that a chemical bond is established between the metal d-orbital electrons and the nonbonding 2p-orbital electrons of the oxygen anions on the Al2O3 surface. An increasing number of occupied metal-sapphire antibonding molecular orbitals explains qualitatively the observed decrease of contact shear strength through the series Fe, Ni, Cu, and Ag.

  19. Inversion domains in AlN grown on (0001) sapphire

    SciTech Connect

    Jasinski, J.; Liliental-Weber, Z.; Paduano, Q.S.; Weyburne, D.W.

    2003-08-25

    Al-polarity inversion domains formed during AlN layer growth on (0001) sapphire were identified using transmission electron microscopy (TEM). They resemble columnar inversion domains reported for GaN films grown on (0001) sapphire. However, for AlN, these columns have a V-like shape with boundaries that deviate by 2 {+-} 0.5{sup o} from the c-axis. TEM identification of these defects agrees with the post-growth surface morphology as well as with the microstructure revealed by etching in hot aqueous KOH.

  20. SERS Raman Sensor Based on Diameter-Modulated Sapphire Fiber

    SciTech Connect

    Shimoji, Yutaka

    2010-08-09

    Surface enhanced Raman scattering (SERS) has been observed using a sapphire fiber coated with gold nano-islands for the first time. The effect was found to be much weaker than what was observed with a similar fiber coated with silver nanoparticles. Diameter-modulated sapphire fibers have been successfully fabricated on a laser heated pedestal growth system. Such fibers have been found to give a modest increase in the collection efficiency of induced emission. However, the slow response of the SERS effect makes it unsuitable for process control applications.

  1. Sapphire fiber interferometer for microdisplacement measurements at high temperature

    NASA Technical Reports Server (NTRS)

    Murphy, Kent A.; Feth, Shari; Vengsarkar, Ashish M.; Claus, Richard O.

    1992-01-01

    Attention is given to the use of a short-length multimode sapphire rod as an extension to a conventional Michelson interferometric configuration, but with operation of Fabry-Perot cavity-based sensor element type. The performance of such a device as an interferometric sensor is demonstrated for a case where the interference between the reflections from the sapphire-air interface and an air-metallic surface is inspected for microdisplacements of the metallic surface. A detailed account is given of the sensor's fabrication procedure; results are presented for the detection of surface-acoustic waves.

  2. JFET/SOS (Junction Field-Effect Transistor/Silicon-on-Sapphire) devices: Gamma-radiation-induced effects

    NASA Astrophysics Data System (ADS)

    Halle, Linda F.; Zietlow, Thomas C.; Barnes, Charles E.

    1988-03-01

    Enhancement and depletion mode JFETs have been fabricated on silicon-on-sapphire substrates. When these devices are irradiated under bias with a Co-60 source, their drain currents increase, and their threshold voltages shift in such a way that the devices become more difficult to pinch off. These effects can be explained by positive charge trapping at the silicon/sapphire interface. Gate to drain leakage currents also increase, and can be traced to interface effects at the gate edges rather than to the passivating oxide. These effects were studied as a function of dose rate and postirradiation annealing. Deep-level transient spectroscopy (DLTS) was performed prior to and following both irradiation and anneal on both the gate-drain and gate-source p-n junctions. DLTS trap bands were observed whose characteristics depended on the depth of the depletion layer and on the total gamma dose received. The DLTS spectra suggest that a continuum of levels is responsible for the bands, and that the emission kinetics are influenced by band bending at the Si/sapphire interface. The major bands corresponded in temperature with steps in capacitance-temperature curves. A correlation of these steps with the transistor characteristics suggests that channel pinch off can be influenced by capture and emission at deep centers.

  3. Bulk vertical micromachining of single-crystal sapphire using inductively coupled plasma etching for x-ray resonant cavities

    NASA Astrophysics Data System (ADS)

    Chen, P.-C.; Lin, P.-T.; Mikolas, D. G.; Tsai, Y.-W.; Wang, Y.-L.; Fu, C.-C.; Chang, S.-L.

    2015-01-01

    To provide coherent x-ray sources for probing the dynamic structures of solid or liquid biological substances on the picosecond timescale, a high-aspect-ratio x-ray resonator cavity etched from a single crystal substrate with a nearly vertical sidewall structure is required. Although high-aspect-ratio resonator cavities have been produced in silicon, they suffer from unwanted multiple beam effects. However, this problem can be avoided by using the reduced symmetry of single-crystal sapphire in which x-ray cavities may produce a highly monochromatic transmitted x-ray beam. In this study, we performed nominal 100 µm deep etching and vertical sidewall profiles in single crystal sapphire using inductively coupled plasma (ICP) etching. The large depth is required to intercept a useful fraction of a stopped-down x-ray beam, as well as for beam clearance. An electroplated Ni hard mask was patterned using KMPR 1050 photoresist and contact lithography. The quality and performance of the x-ray cavity depended upon the uniformity of the cavity gap and therefore verticality of the fabricated vertical sidewall. To our knowledge, this is the first report of such deep, vertical etching of single-crystal sapphire. A gas mixture of Cl2/BCl3/Ar was used to etch the sapphire with process variables including BCl3 flow ratio and bias power. By etching for 540 min under optimal conditions, we obtained an x-ray resonant cavity with a depth of 95 µm, width of ~30 µm, gap of ~115 µm and sidewall profile internal angle of 89.5°. The results show that the etching parameters affected the quality of the vertical sidewall, which is essential for good x-ray resonant cavities.

  4. Silicon-Germanium Films Grown on Sapphire for Ka-Band Communications Applications

    NASA Technical Reports Server (NTRS)

    Alterovitz, Samuel A.; Mueller, Carl H.; Croke, Edward T.

    2004-01-01

    NASA's vision in the space communications area is to develop a broadband data network in which there is a high degree of interconnectivity among the various satellite systems, ground stations, and wired systems. To accomplish this goal, we will need complex electronic circuits integrating analog and digital data handling at the Ka-band (26 to 40 GHz). The purpose of this project is to show the feasibility of a new technology for Ka-band communications applications, namely silicon germanium (SiGe) on sapphire. This new technology will have several advantages in comparison to the existing silicon-substrate- based circuits. The main advantages are extremely low parasitic reactances that enable much higher quality active and passive components, better device isolation, higher radiation tolerance, and the integration of digital and analog circuitry on a single chip.

  5. Modal reduction in single crystal sapphire optical fiber

    NASA Astrophysics Data System (ADS)

    Cheng, Yujie; Hill, Cary; Liu, Bo; Yu, Zhihao; Xuan, Haifeng; Homa, Daniel; Wang, Anbo; Pickrell, Gary

    2015-10-01

    A type of single crystal sapphire optical fiber (SCSF) design is proposed to reduce the number of guided modes via a highly dispersive cladding with a periodic array of high- and low-index regions in the azimuthal direction. The structure retains a "core" region of pure single crystal (SC) sapphire in the center of the fiber and a "cladding" region of alternating layers of air and SC sapphire in the azimuthal direction that is uniform in the radial direction. The modal characteristics and confinement losses of the fundamental mode were analyzed via the finite element method by varying the effective core diameter and the dimensions of the "windmill"-shaped cladding. The simulation results showed that the number of guided modes was significantly reduced in the windmill fiber design, as the radial dimension of the air and SC sapphire cladding regions increase with corresponding decrease in the azimuthal dimension. It is anticipated that the windmill SCSF will readily improve the performance of current fiber optic sensors in the harsh environment and potentially enable those that were limited by the extremely large modal volume of unclad SCSF.

  6. Oxidation states of Fe and Ti in blue sapphire

    NASA Astrophysics Data System (ADS)

    Wongrawang, P.; Monarumit, N.; Thammajak, N.; Wathanakul, P.; Wongkokua, W.

    2016-02-01

    X-ray absorption near-edge spectroscopy (XANES) can be used to study the oxidation state of a dilute system such as transition metal defects in solid-state samples. In blue sapphire, Fe and Ti are defects that cause the blue color. Inter-valence charge transfer (IVCT) between Fe2+ and Ti4+ has been proposed to describe the optical color’s origin. However, the existence of divalent iron cations has not been thoroughly investigated. Fluorescent XANES is therefore employed to study K-edge absorptions of Fe and Ti cations in various blue sapphire samples including natural, synthetic, diffused and heat-treated sapphires. All the samples showed an Fe absorption edge at 7124 eV, corresponding to the Fe3+ state; and Ti at 4984 eV, corresponding to Ti4+. From these results, we propose Fe3+-Ti4+ mixed acceptor states located at 1.75 eV and 2.14 eV above the valence band of corundum, that correspond to 710 nm and 580 nm bands of UV-vis absorption spectra, to describe the cause of the color of blue sapphire.

  7. Modal reduction in single crystal sapphire optical fiber

    SciTech Connect

    Cheng, Yujie; Hill, Cary; Liu, Bo; Yu, Zhihao; Xuan, Haifeng; Homa, Daniel; Wang, Anbo; Pickrell, Gary

    2015-10-12

    A new type of single crystal sapphire optical fiber (SCSF) design is proposed to reduce the number of guided modes via a highly dispersive cladding with a periodic array of high and low index regions in the azimuthal direction. The structure retains a “core” region of pure single crystal (SC) sapphire in the center of the fiber and a “cladding” region of alternating layers of air and SC sapphire in the azimuthal direction that is uniform in the radial direction. The modal characteristics and confinement losses of the fundamental mode were analyzed via the finite element method by varying the effective core diameter and the dimensions of the “windmill” shaped cladding. The simulation results showed that the number of guided modes were significantly reduced in the “windmill” fiber design, as the radial dimension of the air and SC sapphire cladding regions increase with corresponding decrease in the azimuthal dimension. It is anticipated that the “windmill” SCSF will readily improve the performance of current fiber optic sensors in the harsh environment and potentially enable those that were limited by the extremely large modal volume of unclad SCSF.

  8. High-temperature healing of lithographically introduced cracks in sapphire

    SciTech Connect

    Rodel, J.; Glaeser, A.M. . Dept. of Materials Science and Mineral Engineering)

    1990-03-01

    A new method for producing controlled-geometry, controlled-crystallography, cracklike defects using photolithography has been developed. The method has been applied to sapphire, and used to study crack healing behavior at 1800{degrees}C. Effects of crack face and crack perimeter crystallography, crack face microstructure, and impurities on healing behavior have been identified.

  9. High power continuous-wave titanium:sapphire laser

    DOEpatents

    Erbert, G.V.; Bass, I.L.; Hackel, R.P.; Jenkins, S.L.; Kanz, V.K.; Paisner, J.A.

    1993-09-21

    A high-power continuous-wave laser resonator is provided, wherein first, second, third, fourth, fifth and sixth mirrors form a double-Z optical cavity. A first Ti:sapphire rod is disposed between the second and third mirrors and at the mid-point of the length of the optical cavity, and a second Ti:sapphire rod is disposed between the fourth and fifth mirrors at a quarter-length point in the optical cavity. Each Ti:sapphire rod is pumped by two counter-propagating pump beams from a pair of argon-ion lasers. For narrow band operation, a 3-plate birefringent filter and an etalon are disposed in the optical cavity so that the spectral output of the laser consists of 5 adjacent cavity modes. For increased power, seventy and eighth mirrors are disposed between the first and second mirrors to form a triple-Z optical cavity. A third Ti:sapphire rod is disposed between the seventh and eighth mirrors at the other quarter-length point in the optical cavity, and is pumped by two counter-propagating pump beams from a third pair of argon-ion lasers. 5 figures.

  10. High power continuous-wave titanium:sapphire laser

    DOEpatents

    Erbert, Gaylen V.; Bass, Isaac L.; Hackel, Richard P.; Jenkins, Sherman L.; Kanz, Vernon K.; Paisner, Jeffrey A.

    1993-01-01

    A high-power continuous-wave laser resonator (10) is provided, wherein first, second, third, fourth, fifth and sixth mirrors (11-16) form a double-Z optical cavity. A first Ti:Sapphire rod (17) is disposed between the second and third mirrors (12,13) and at the mid-point of the length of the optical cavity, and a second Ti:Sapphire rod (18) is disposed between the fourth and fifth mirrors (14,15) at a quarter-length point in the optical cavity. Each Ti:Sapphire rod (17,18) is pumped by two counter-propagating pump beams from a pair of argon-ion lasers (21-22, 23-24). For narrow band operation, a 3-plate birefringent filter (36) and an etalon (37) are disposed in the optical cavity so that the spectral output of the laser consists of 5 adjacent cavity modes. For increased power, seventy and eighth mirrors (101, 192) are disposed between the first and second mirrors (11, 12) to form a triple-Z optical cavity. A third Ti:Sapphire rod (103) is disposed between the seventh and eighth mirrors (101, 102) at the other quarter-length point in the optical cavity, and is pumped by two counter-propagating pump beams from a third pair of argon-ion lasers (104, 105).

  11. Modal reduction in single crystal sapphire optical fiber

    DOE PAGES

    Cheng, Yujie; Hill, Cary; Liu, Bo; Yu, Zhihao; Xuan, Haifeng; Homa, Daniel; Wang, Anbo; Pickrell, Gary

    2015-10-12

    A new type of single crystal sapphire optical fiber (SCSF) design is proposed to reduce the number of guided modes via a highly dispersive cladding with a periodic array of high and low index regions in the azimuthal direction. The structure retains a “core” region of pure single crystal (SC) sapphire in the center of the fiber and a “cladding” region of alternating layers of air and SC sapphire in the azimuthal direction that is uniform in the radial direction. The modal characteristics and confinement losses of the fundamental mode were analyzed via the finite element method by varying themore » effective core diameter and the dimensions of the “windmill” shaped cladding. The simulation results showed that the number of guided modes were significantly reduced in the “windmill” fiber design, as the radial dimension of the air and SC sapphire cladding regions increase with corresponding decrease in the azimuthal dimension. It is anticipated that the “windmill” SCSF will readily improve the performance of current fiber optic sensors in the harsh environment and potentially enable those that were limited by the extremely large modal volume of unclad SCSF.« less

  12. Characterization of refractory materials using sapphire strain gages

    SciTech Connect

    Tran, T.A.; Greene, J.A.; Alcock, M.A.

    1995-12-31

    A high-temperature sapphire strain gage based on the optical fiber extrinsic Fizeau interferometric sensor (EFI) was used to measure strain on a compressive loaded silicon carbide rod at a temperature of 1100{degrees}C. Experimental strain sensitivities on the order of 1 {mu}{epsilon} were obtained.

  13. Optical Properties of Single-Crystal Sapphire Fibers

    NASA Astrophysics Data System (ADS)

    Merberg, Glenn N.

    1992-01-01

    The optical properties of edge-defined, film-fed growth (EFG) and laser heated pedestal growth (LHPG) sapphire fibers were characterized, and the utility of these fibers for medical and industrial applications assessed. While EFG fibers are not yet produced with good optical quality, they offer enormous potential for mass production of sapphire fibers. The LHPG process has been successfully employed to produce good optical quality sapphire. This dissertation focussed on the optical attenuation mechanisms which limit the transmission properties of both EFG and LHPG sapphire fibers. The EFG fibers obtained for this research were found to contain bubbles along the fiber axes. As a result of the bubble inclusions, the measured optical scattering coefficients of the fibers were quite high. At a wavelength of 2.94 mum, a typical 280 μm diameter EFG fiber had a total attenuation coefficient of 18 dB/m. The contribution of scattering to this loss was measured as 17 dB/m, and the absorptive component as measured by laser calorimetry was 1 dB/m. The wavelength dependence of the scattering in EFG fibers was found to be lambda^{-1.5}, which is consistent with a Mie scattering model for scattering of light by bubbles on the dimensional order of the wavelength. Some of the LHPG fibers grown at Rutgers had measured attenuation coefficients of less than 2 dB/m at 2.94 μm wavelength. The absorptive component of this loss was measured by laser calorimetry as 0.7 dB/m, while the scattering loss was 1 dB/m. Optical scattering in Rutgers LHPG fibers had a lambda^ {-4} wavelength dependence, although the scattering coefficients were considerably higher than predicted for intrinsic scattering. Although visible absorbing color -centers were discovered in Rutgers LHPG fibers, excessive optical scattering dominated the attenuation in this spectral region. Melt extruded Teflon-FEP claddings were applied to LHPG fibers. The claddings were very effective in reducing evanescent coupling of Er

  14. Sub-surface oxide features at the aluminum-sapphire interface after low temperature annealing

    NASA Astrophysics Data System (ADS)

    Dutta, Sreya

    This work focuses on the formation of sub-surface oxide features that form at the aluminum-sapphire interface during a low temperature heat-treatment. The features consist of two parts, stable alpha-alumina ridges on the substrate, and faceted pyramidal structures composed of thin, low-temperature oxide shells that are bounded by the ridges. It is surprising to observe the formation of thermodynamically stable alpha-alumina at a low temperature. The ridges are epitaxial with the (0001) sapphire substrate and the overlying metal. The pyramidal features resemble closely the Wulff shape in aluminum. Experiments show that these features are underlying the annealing hillocks. This work is a detailed study of such oxide interfacial features associated with hollow hillocks. At the annealing temperatures (below the melting point of aluminum), the aluminum thin film is subjected to compressive stresses arising from the thermal expansion coefficient mismatch and this is aided by dewetting at the aluminum-sapphire interface. Creep cavitation and grain boundary sliding are postulated to help in the cavity formation. Annealing holes are also observed in the thin films. Two different types of holes are seen: dendritic branched holes and hexagonal faceted holes (drums). At lower temperature and thickness, dendritic holes are seen to be formed at the grain boundaries. The drums form within the grains at higher temperatures and in thicker films. The drums have a surface oxide layer suspended on the top. It is postulated that clustering of vacancies due to the presence of irregularities, defects, and dislocations at the interface as well as dewetting causes the nucleation of the drums at the interface. Numerous hillock-hole couples were seen. Thinning of the metal in areas near the hillocks could possibly aid in the hole formation process. It is speculated that the hole growth occurred during the cooling stage when the film was subjected to tensile stresses. Another interesting

  15. Self-assembled growth and structural analysis of inclined GaN nanorods on nanoimprinted m-sapphire using catalyst-free metal-organic chemical vapor deposition

    NASA Astrophysics Data System (ADS)

    Lee, Kyuseung; Chae, Sooryong; Jang, Jongjin; Min, Daehong; Kim, Jaehwan; Nam, Okhyun

    2016-04-01

    In this study, self-assembled inclined (1-10-3)-oriented GaN nanorods (NRs) were grown on nanoimprinted (10-10) m-sapphire substrates using catalyst-free metal-organic chemical vapor deposition. According to X-ray phi-scans, the inclined GaN NRs were tilted at an angle of ˜57.5° to the [10-10]sapp direction. Specifically, the GaN NRs grew in a single inclined direction to the [11-20]sapp. Uni-directionally inclined NRs were formed through the one-sided (10-11)-faceted growth of the interfacial a-GaN plane layer. It was confirmed that a thin layer of a-GaN was formed on r-facet nanogrooves of the m-sapphire substrate by nitridation. The interfacial a-GaN nucleation affected both the inclined angle and the growth direction of the inclined GaN NRs. Using X-ray diffraction and selective area electron diffraction, the epitaxial relationship between the inclined (1-10-3) GaN NRs and interfacial a-GaN layer on m-sapphire substrates was systematically investigated. Moreover, the inclined GaN NRs were observed to be mostly free of stacking fault-related defects using high-resolution transmission electron microscopy.

  16. Single-Crystal Sapphire Optical Fiber Sensor Instrumentation

    SciTech Connect

    Pickrell, Gary; Scott, Brian; Wang, Anbo; Yu, Zhihao

    2013-12-31

    This report summarizes technical progress on the program “Single-Crystal Sapphire Optical Fiber Sensor Instrumentation,” funded by the National Energy Technology Laboratory of the U.S. Department of Energy, and performed by the Center for Photonics Technology of the Bradley Department of Electrical and Computer Engineering at Virginia Tech. This project was completed in three phases, each with a separate focus. Phase I of the program, from October 1999 to April 2002, was devoted to development of sensing schema for use in high temperature, harsh environments. Different sensing designs were proposed and tested in the laboratory. Phase II of the program, from April 2002 to April 2009, focused on bringing the sensor technologies, which had already been successfully demonstrated in the laboratory, to a level where the sensors could be deployed in harsh industrial environments and eventually become commercially viable through a series of field tests. Also, a new sensing scheme was developed and tested with numerous advantages over all previous ones in Phase II. Phase III of the program, September 2009 to December 2013, focused on development of the new sensing scheme for field testing in conjunction with materials engineering of the improved sensor packaging lifetimes. In Phase I, three different sensing principles were studied: sapphire air-gap extrinsic Fabry-Perot sensors; intensity-based polarimetric sensors; and broadband polarimetric sensors. Black body radiation tests and corrosion tests were also performed in this phase. The outcome of the first phase of this program was the selection of broadband polarimetric differential interferometry (BPDI) for further prototype instrumentation development. This approach is based on the measurement of the optical path difference (OPD) between two orthogonally polarized light beams in a single-crystal sapphire disk. At the beginning of Phase II, in June 2004, the BPDI sensor was tested at the Wabash River coal gasifier

  17. Study of defect management in the growth of semipolar (11-22) GaN on patterned sapphire

    NASA Astrophysics Data System (ADS)

    Vennéguès, P.; Tendille, F.; De Mierry, P.

    2015-08-01

    This work describes, using mainly transmission electron microscopy as an investigation tool, the nature and behaviour of the crystalline defects which are present in (11-22) semipolar GaN films grown epitaxially on patterned r-sapphire substrates using a 3 step growth process. The microstructure at these different growth stages is described. The independent 3D-crystallites nucleated on the substrate surface contain threading dislocations resulting from the epitaxy on c-sapphire facets and basal stacking faults (BSFs), mainly in the  -c-wings. These defects are concentrated in a few hundred nanometre wide stripe-like regions emerging on the top facet of the islands. By a careful choice of the growth conditions, these defective regions may be overgrown by defect-free material, blocking their propagation towards the coalesced surface. However, when the 3D crystals coalesce, new dislocations together with very few BSFs are created at the coalescence boundaries. These coalescence defects propagate to the surface of the films in (0001) planes. In summary, the control of the nucleation and propagation of the crystalline defects allows obtaining large area semipolar films with very low defect densities: 7   ×   107 cm-2 for TDs and 70 cm-1 for BSFs.

  18. Strong Geometrical Effects in Submillimeter Selective Area Growth and Light Extraction of GaN Light Emitting Diodes on Sapphire

    PubMed Central

    Tanaka, Atsunori; Chen, Renjie; Jungjohann, Katherine L.; Dayeh, Shadi A.

    2015-01-01

    Advanced semiconductor devices often utilize structural and geometrical effects to tailor their characteristics and improve their performance. We report here detailed understanding of such geometrical effects in the epitaxial selective area growth of GaN on sapphire substrates and utilize them to enhance light extraction from GaN light emitting diodes. Systematic size and spacing effects were performed side-by-side on a single 2” sapphire substrate to minimize experimental sampling errors for a set of 144 pattern arrays with circular mask opening windows in SiO2. We show that the mask opening diameter leads to as much as 4 times increase in the thickness of the grown layers for 20 μm spacings and that spacing effects can lead to as much as 3 times increase in thickness for a 350 μm dot diameter. We observed that the facet evolution in comparison with extracted Ga adatom diffusion lengths directly influences the vertical and lateral overgrowth rates and can be controlled with pattern geometry. Such control over the facet development led to 2.5 times stronger electroluminescence characteristics from well-faceted GaN/InGaN multiple quantum well LEDs compared to non-faceted structures. PMID:26611405

  19. Strong geometrical effects in submillimeter selective area growth and light extraction of GaN light emitting diodes on sapphire

    DOE PAGES

    Tanaka, Atsunori; Chen, Renjie; Jungjohann, Katherine L.; Dayeh, Shadi A.

    2015-11-27

    Advanced semiconductor devices often utilize structural and geometrical effects to tailor their characteristics and improve their performance. Our detailed understanding of such geometrical effects in the epitaxial selective area growth of GaN on sapphire substrates is reported here, and we utilize them to enhance light extraction from GaN light emitting diodes. Systematic size and spacing effects were performed side-by-side on a single 2” sapphire substrate to minimize experimental sampling errors for a set of 144 pattern arrays with circular mask opening windows in SiO2. We show that the mask opening diameter leads to as much as 4 times increase inmore » the thickness of the grown layers for 20 μm spacings and that spacing effects can lead to as much as 3 times increase in thickness for a 350 μm dot diameter. We also observed that the facet evolution in comparison with extracted Ga adatom diffusion lengths directly influences the vertical and lateral overgrowth rates and can be controlled with pattern geometry. Lastly, such control over the facet development led to 2.5 times stronger electroluminescence characteristics from well-faceted GaN/InGaN multiple quantum well LEDs compared to non-faceted structures.« less

  20. Strong geometrical effects in submillimeter selective area growth and light extraction of GaN light emitting diodes on sapphire

    SciTech Connect

    Tanaka, Atsunori; Chen, Renjie; Jungjohann, Katherine L.; Dayeh, Shadi A.

    2015-11-27

    Advanced semiconductor devices often utilize structural and geometrical effects to tailor their characteristics and improve their performance. Our detailed understanding of such geometrical effects in the epitaxial selective area growth of GaN on sapphire substrates is reported here, and we utilize them to enhance light extraction from GaN light emitting diodes. Systematic size and spacing effects were performed side-by-side on a single 2” sapphire substrate to minimize experimental sampling errors for a set of 144 pattern arrays with circular mask opening windows in SiO2. We show that the mask opening diameter leads to as much as 4 times increase in the thickness of the grown layers for 20 μm spacings and that spacing effects can lead to as much as 3 times increase in thickness for a 350 μm dot diameter. We also observed that the facet evolution in comparison with extracted Ga adatom diffusion lengths directly influences the vertical and lateral overgrowth rates and can be controlled with pattern geometry. Lastly, such control over the facet development led to 2.5 times stronger electroluminescence characteristics from well-faceted GaN/InGaN multiple quantum well LEDs compared to non-faceted structures.

  1. Progress Report for a New Cryogenic Sapphire Oscillator

    NASA Technical Reports Server (NTRS)

    Wang, Rabi T.; Dick, G. J.; Tjoelker, R. L.

    2006-01-01

    We present design progress and subsystem test results for a new short-term frequency standard, the Voltage Controlled Sapphire Oscillator (VCSO). Included are sapphire resonator and coupling design, cryocooler environmental sensitivity tests, Q measurement results, and turnover temperature results. A previous report presented history of the design related to resonator frequency and frequency compensation [1]. Performance goals are a frequency stability of 1x10(exp -14) (1 second less than or equal to (tau) less than or equal to 100 seconds) and two years or more continuous operation. Long-term operation and small size are facilitated by use of a small Stirling cryo-cooler (160W wall power) with an expected 5 year life.

  2. Inversion domains in GaN grown on sapphire

    SciTech Connect

    Romano, L.T.; Northrup, J.E.; OKeefe, M.A.

    1996-10-01

    Planar defects observed in GaN films grown on (0001) sapphire have been identified as inversion domain boundaries (IDBs) by a combination of high resolution transmission electron microscopy, multiple dark field imaging, and convergent beam electron diffraction techniques. Films grown by molecular beam epitaxy (MBE), metalorganic vapor deposition (MOCVD), and hydride vapor phase epitaxy (HVPE) were investigated and all were found to contain IDBs. The IDBs in the MBE and HVPE films extended from the interface to the film surface and formed columnar domains that ranged in width from 3 to 20 nm in the MBE films and up to 100 nm in the HVPE films. For the films investigated, the MBE films had the highest density, and the MOCVD films had the lowest density of IDBs. The nucleation of inversion domains (IDs) may result from step-related inhomogeneities of the GaN/sapphire interface. {copyright} {ital 1996 American Institute of Physics.}

  3. SAPPHIRE WILDERNESS STUDY AREA AND CONTIGUOUS ROADLESS AREAS, MONTANA.

    USGS Publications Warehouse

    Wallace, C.A.; Bannister, D'Arcy P.

    1984-01-01

    Geologic and mineral studies located sulfide-bearing quartz veins with demonstrated metallic mineral resources in granitic and metasedimentary rocks in several parts of the Sapphire Wilderness Study Area and contiguous roadless areas, Montana. Mines and prospects contain demonstrated resources of gold, silver, lead, copper, and zinc. Gold-bearing placers occur downstream from each of these vein occurrences; most of the gold placers have a probable mineral-resource potential. A replacement body of sulfide minerals is present at the Senate mine adjacent to the Sapphire Wilderness Study Area. Around the Senate mine is an area of probable mineral-resource potential that extends into the study area. There is little promise for the occurrence of energy resources in the study area.

  4. Ti:sapphire laser with long-pulse lamp pumping

    NASA Astrophysics Data System (ADS)

    Koselja, Michael P.; Kubelka, Jiri; Kvapil, Jiri

    1992-06-01

    Lamp pumping of Ti:Sapphire has some advantages over laser pumping and represents some interest due to possible applications. The paper will present laser behavior of Ti:Sapphire under very long lamp pulse pumping. Pulse lamp duration (FWHM) was more than 100 times greater than the lifetime of Ti3+. Output energy with no tuning element was achieved greater than 1.5 J with 0.12% electrical-to-optical efficiency. Dimensions of the rod used was 7 mm in diameter and 148 mm in length. The doping level of Ti3+ was 0.09% Ti2O3 in the rod. Tuning characteristics with different tuning elements are also presented. Further development to obtain CW lamp pumping operation will be discussed.

  5. A neutron method for NDA analysis in the SAPPHIRE Project

    SciTech Connect

    Lewis, K.D.

    1995-01-09

    The implementation of Project SAPPHIRE, the top secret mission to the Republic of Kazakhstan to recover weapons grade nuclear materials, consisted of four major elements: (1) the re-packing of fissile material from Kazakh containers into suitable US containers; (2) nondestructive analyses (NDA) to quantify the U-235 content of each container for Nuclear Criticality Safety and compliance purposes; (3) the packaging of the fissile material containers into 6M/2R drums, which are internationally approved for shipping fissile material; and (4) the shipping or transport of the recovered fissile material to the United States. This paper discusses the development and application of a passive neutron counting technique used in the NDA phase of SAPPHIRE operations to analyze uranium/beryllium (U/Be) alloys and compounds for U-235 content.

  6. Measurements of prompt radiation induced conductivity of alumina and sapphire.

    SciTech Connect

    Hartman, E. Frederick; Zarick, Thomas Andrew; Sheridan, Timothy J.; Preston, Eric F.

    2011-04-01

    We performed measurements of the prompt radiation induced conductivity in thin samples of Alumina and Sapphire at the Little Mountain Medusa LINAC facility in Ogden, UT. Five mil thick samples were irradiated with pulses of 20 MeV electrons, yielding dose rates of 1E7 to 1E9 rad/s. We applied variable potentials up to 1 kV across the samples and measured the prompt conduction current. Analysis rendered prompt conductivity coefficients between 1E10 and 1E9 mho/m/(rad/s), depending on the dose rate and the pulse width for Alumina and 1E7 to 6E7 mho/m/(rad/s) for Sapphire.

  7. Surface modification of sapphire for enhanced infrared window performance

    SciTech Connect

    McHargue, C.J.; Joslin, D.L.; Williams, J.M.; O`Hern, M.E.

    1993-09-01

    Two ion implantation conditions were evaluated for improving the mechanical performance of sapphire IR window material. Both increased the average strength as measured by 4-point bend tests and were effective in preventing the propagation of surface flaws. Ion implantation that produced a damaged crystalline surface improved the reliability at lower stresses more than the implantation that produced an amorphous surface. Neither process significantly affected the IR transmission.

  8. Epitaxial growth of hexagonal silicon polytypes on sapphire

    SciTech Connect

    Pavlov, D. A.; Pirogov, A. V. Krivulin, N. O.; Bobrov, A. I.

    2015-01-15

    The formation of a single-crystal silicon polytype is observed in silicon-on-sapphire structures by high-resolution transmission electron microscopy. The appearance of inclusions with a structure different from that of diamond is attributed to the formation of strong-twinning regions and the aggregation of stacking faults, which form their own crystal structure in the crystal lattice of silicon. It is demonstrated that the given modification belongs to the 9R silicon polytype.

  9. [MORPHOLOGICAL FEATURES OF NEUTROPHILS AND EOSINOPHILS GRANULES IN SAPPHIRE MINKS].

    PubMed

    Uzenbaeva, L B; Kizhina, A G; Ilyukha, V A

    2015-01-01

    It has been established that sapphire minks have abnormality of subcellular structure of blood and bone marrow neutrophils and eosinophils. The abnormality consists in forming of abnormal "giant" granules. The si- ze and the number of abnormal granules significantly change during maturation of leucocytes in bone marrow. We have found differences between abnormal granules forming in neutrophils and eosinophils that depend on the maturing stage and the cells life cycle duration as well as morphofunctional features of these granulocytes. PMID:26863773

  10. Fractal analysis of surface topography in ground monocrystal sapphire

    NASA Astrophysics Data System (ADS)

    Wang, Qiuyan; Liang, Zhiqiang; Wang, Xibin; Zhao, Wenxiang; Wu, Yongbo; Zhou, Tianfeng

    2015-02-01

    The surface characterization of ground monocrystal sapphire is investigated by fractal analysis method. A serial of ground sapphire surfaces in ductile removal and brittle removal mode are obtained by grinding experiments, and their three dimensional (3D) and two dimensional (2D) fractal dimensions are calculated and analyzed by box-counting methods. The 3D surface fractal dimension Ds shows a negative correlation with the surface roughness parameter Ra and is sensitive to the ground surface defects. For the ground surface with larger fractal dimension Ds, its micro-topography is more exquisite with minor defects. Once the fractal dimension Ds become smaller, deep cracks and pronounced defects are exhibited in ground surface. Moreover, the material removal mode can be implied from the distribution of 2D cross-sectional profile fractal dimension DL. The workpiece surface generated in ductile removal mode has high surface quality with high 2D and 3D fractal dimensions. This study indicates that the box-counting fractal analysis is an effective method to evaluate ground sapphire surface comprehensively.

  11. Titanium-doped sapphire laser research and design study

    NASA Technical Reports Server (NTRS)

    Moulton, Peter F.

    1987-01-01

    Three main topics were considered in this study: the fundamental laser parameters of titanium-doped sapphire, characterization of commercially grown material, and design of a tunable, narrow-linewidth laser. Fundamental parameters investigated included the gain cross section, upper-state lifetime as a function of temperature and the surface-damage threshold. Commercial material was found to vary widely in the level of absorption of the laser wavelength with the highest absorption in Czochralski-grown crystals. Several Yi:sapphire lasers were constructed, including a multimode laser with greater than 50mJ of output energy and a single-transverse-mode ring laser, whose spectral and temporal characteristics were completely characterized. A design for a narrow-linewidth (single-frequency) Ti:sapphire laser was developed, based on the results of the experimental work. The design involves the use of a single-frequency, quasi-cw master oscillator, employed as an injection source for a pulsed ring laser.

  12. Microstructure evolution in carbon-ion implanted sapphire

    SciTech Connect

    Orwa, J. O.; McCallum, J. C.; Jamieson, D. N.; Prawer, S.; Peng, J. L.; Rubanov, S.

    2010-01-15

    Carbon ions of MeV energy were implanted into sapphire to fluences of 1x10{sup 17} or 2x10{sup 17} cm{sup -2} and thermally annealed in forming gas (4% H in Ar) for 1 h. Secondary ion mass spectroscopy results obtained from the lower dose implant showed retention of implanted carbon and accumulation of H near the end of range in the C implanted and annealed sample. Three distinct regions were identified by transmission electron microscopy of the implanted region in the higher dose implant. First, in the near surface region, was a low damage region (L{sub 1}) composed of crystalline sapphire and a high density of plateletlike defects. Underneath this was a thin, highly damaged and amorphized region (L{sub 2}) near the end of range in which a mixture of i-carbon and nanodiamond phases are present. Finally, there was a pristine, undamaged sapphire region (L{sub 3}) beyond the end of range. In the annealed sample some evidence of the presence of diamond nanoclusters was found deep within the implanted layer near the projected range of the C ions. These results are compared with our previous work on carbon implanted quartz in which nanodiamond phases were formed only a few tens of nanometers from the surface, a considerable distance from the projected range of the ions, suggesting that significant out diffusion of the implanted carbon had occurred.

  13. Failure mechanism of single crystal alumina (sapphire) in conventional machining

    SciTech Connect

    Liang, H.

    1995-12-31

    This work is to investigate the types of common failure of sapphire during machining. The various features of failure indicated and types of failure characteristics will be discussed, and where appropriate, several of the fundamental mechanisms involved will be explained. The objective of this work is to show how sapphire is removed during machining. Based on a good understanding of the failure mechanism, the machining conditions can be optimized. Machining methods discussed in this work are all conventional methods. They include grinding, diamond saw cutting, diamond core drilling, abrasive and chemomechanical polishing. The machining conditions used for each different orientation of crystal planes were consistent. The machining surfaces were observed by using optical microscope and scanning electron microscope. The surface roughness and subsurface damage were also measured and compared. Under a consistent machining condition, sapphire is machined based on its different crystal orientations. Before machining, these crystals were annealed in order to get rid of the preexisting defects. After machining, these samples were etched, and observed under optical and scanning electronic microscope. A series of observations was compared. The machining induced failures, as observed, for example, are cleavage, twinning, chipping, and pitting, etc. The effect of crystal orientation on machining is also discussed. Results show the effect of crystal orientation on material removal rate, surface and subsurface damage and thereafter surface finish. It suggests a certain orientation of crystal for a certain type of machining method.

  14. Survival of single crystal sapphire implants supporting mandibular overdentures.

    PubMed

    Berge, T I; Grønningsaeter, A G

    2000-04-01

    One hundred and sixteen sapphire (Bioceram, Kyocera) implants were inserted in 30 patients between 1984 and 1991 to support mandibular overdentures. Survival analyses were made on the basis of clinical and radiographic follow-up evaluation for 15 patients with 56 implants. For the 15 patients who were lost to follow-up, 7 of whom were deceased, reviews of records and available radiographs determined outcome and observation time. The resulting Kaplan-Meier cumulative survival rate for the sapphire implants was 68.66%, mean survival time 11.44 years, 95% confidence interval 10.56-12.32 years. Uni- and multivariate analysis using the Cox Regression model, indicated an increased risk of implant failure in patients over 60 years at time of operation, and in patients who smoke. Limited experience in implant surgery were associated with increased implant failure rate. A qualitative analysis of survived implants showed a mean annual bone loss of 0.2 mm, moderate to excellent plaque control, and excellent to good subjective global assessment of the treatment. The long-term results of the sapphire implant system used for mandibular overdenture support are inferior to other implants systems.

  15. Defect analysis by transmission electron microscopy of epitaxial Al-doped ZnO films grown on (0001) ZnO and a-sapphire by RF magnetron sputtering

    NASA Astrophysics Data System (ADS)

    Rengachari, Mythili; Bikowski, André; Ellmer, Klaus

    2016-07-01

    Microstructural investigations by cross section Transmission Electron Microscopy have been carried out on Al-doped ZnO films epitaxially grown on (0001) ZnO and a-sapphire by RF magnetron sputtering, since it is known that crystallographic defects influence the physical properties of ZnO films. Threading dislocations and basal stacking faults were the predominant defects observed in these films, which were dependent on the type of the substrate and its orientation. The orientational relationship between the ZnO:Al film and the a-sapphire was determined to be ( 11 2 ¯ 0 )sapphire||(0001)ZnO:Al and [0001]sapphire||[ 11 2 ¯ 0 ]ZnO:Al. The density of dislocations in the heteroepitaxial film of ZnO:Al on a-sapphire was higher than that of the homoepitaxial film of ZnO:Al on undoped ZnO, due to the difference in the lattice mismatch, which also affected the crystallinity of the film.

  16. Natural substrate lift-off technique for vertical light-emitting diodes

    NASA Astrophysics Data System (ADS)

    Lee, Chia-Yu; Lan, Yu-Pin; Tu, Po-Min; Hsu, Shih-Chieh; Lin, Chien-Chung; Kuo, Hao-Chung; Chi, Gou-Chung; Chang, Chun-Yen

    2014-04-01

    Hexagonal inverted pyramid (HIP) structures and the natural substrate lift-off (NSLO) technique were demonstrated on a GaN-based vertical light-emitting diode (VLED). The HIP structures were formed at the interface between GaN and the sapphire substrate by molten KOH wet etching. The threading dislocation density (TDD) estimated by transmission electron microscopy (TEM) was reduced to 1 × 108 cm-2. Raman spectroscopy indicated that the compressive strain from the bottom GaN/sapphire was effectively released through the HIP structure. With the adoption of the HIP structure and NSLO, the light output power and yield performance of leakage current could be further improved.

  17. Optical diagnostics of the laser-induced phase transformations in thin germanium films on silicon, sapphire, and fused silica

    NASA Astrophysics Data System (ADS)

    Novikov, H. A.; Batalov, R. I.; Bayazitov, R. M.; Faizrakhmanov, I. A.; Ivlev, G. D.; Prokop'ev, S. L.

    2015-03-01

    The in-situ procedure is used to study the modification of thin (200-600 nm) germanium films induced by nanosecond pulses of a ruby laser. The films are produced using the ion-beam or magnetron sputtering on single-crystalline silicon (Si), sapphire (Al2O3), and fused silica (α-SiO2) substrates. The results on the dynamics of the laser-induced processes are obtained using the optical probing of the irradiated region at wavelengths of λ = 0.53 and 1.06 μm. The results of probing make it possible to determine the threshold laser energy densities that correspond to the Ge and Si melting and the generation of the Ge ablation plasma versus the amount of deposited Ge and thermophysical parameters of the substrate. The reflection oscillograms are used to obtain the dependences of the melt lifetime on the laser-pulse energy density.

  18. Semipolar InGaN/GaN nanostructure light-emitting diodes on c-plane sapphire

    NASA Astrophysics Data System (ADS)

    Rishinaramangalam, Ashwin K.; Nami, Mohsen; Fairchild, Michael N.; Shima, Darryl M.; Balakrishnan, Ganesh; Brueck, S. R. J.; Feezell, Daniel F.

    2016-03-01

    The fabrication of electrically injected triangular-nanostripe core-shell semipolar III-nitride LEDs (TLEDs) is demonstrated using interferometric lithography and catalyst-free bottom-up selective-area metal-organic chemical vapor deposition (MOCVD). This alternative approach enables semipolar orientations on inexpensive, c-plane sapphire substrates, in comparison with planar growth on free-standing GaN substrates. Transmission electron microscopy and energy dispersive X-ray spectroscopy reveal nonuniform quantum well thickness and composition, respectively, as a function of location on the triangular stripes. The broad electroluminescence spectra, wavelength shift with increasing current density, and nonlinear light vs current characteristics are well correlated with the observed quantum-well nonuniformities.

  19. SINGLE-CRYSTAL SAPPHIRE OPTICAL FIBER SENSOR INSTRUMENTATION

    SciTech Connect

    A. Wang; G. Pickrell; R. May

    2002-09-10

    Accurate measurement of temperature is essential for the safe and efficient operation and control of a wide range of industrial processes. Appropriate techniques and instrumentation are needed depending on the temperature measurement requirements in different industrial processes and working environments. Harsh environments are common in many industrial applications. These harsh environments may involve extreme physical conditions, such as high-temperature, high-pressure, corrosive agents, toxicity, strong electromagnetic interference, and high-energy radiation exposure. Due to these severe environmental conditions, conventional temperature sensors are often difficult to apply. This situation has opened a new but challenging opportunity for the sensor society to provide robust, high-performance, and cost-effective temperature sensors capable of operating in those harsh environments. The focus of this research program has been to develop a temperature measurement system for temperature measurements in the primary and secondary stages of slagging gasifiers. For this application the temperature measurement system must be able to withstand the extremely harsh environment posed by the high temperatures and corrosive agents present in these systems. Real-time, accurate and reliable monitoring of temperature for the coal gasification process is important to realize the full economic potential of these gasification systems. Long life and stability of operation in the high temperature environment is essential for the temperature measurement system to ensure the continuous running of the coal gasification system over the long term. In this high temperature and chemically corrosive environment, rather limited high temperature measurement techniques such as high temperature thermocouples and optical/acoustic pyrometers are available, each with their own limitations. In this research program, five different temperature sensing schemes based on the single crystal sapphire

  20. SINGLE-CRYSTAL SAPPHIRE OPTICAL FIBER SENSOR INSTRUMENTATION

    SciTech Connect

    A. Wang; G. Pickrell; R. May

    2002-10-18

    Accurate measurement of temperature is essential for the safe and efficient operation and control of a wide range of industrial processes. Appropriate techniques and instrumentation are needed depending on the temperature measurement requirements in different industrial processes and working environments. Harsh environments are common in many industrial applications. These harsh environments may involve extreme physical conditions, such as high-temperature, high-pressure, corrosive agents, toxicity, strong electromagnetic interference, and high-energy radiation exposure. Due to these severe environmental conditions, conventional temperature sensors are often difficult to apply. This situation has opened a new but challenging opportunity for the sensor society to provide robust, high-performance, and cost-effective temperature sensors capable of operating in those harsh environments. The focus of this research program has been to develop a temperature measurement system for temperature measurements in the primary and secondary stages of slagging gasifiers. For this application the temperature measurement system must be able to withstand the extremely harsh environment posed by the high temperatures and corrosive agents present in these systems. Real-time, accurate and reliable monitoring of temperature for the coal gasification process is important to realize the full economic potential of these gasification systems. Long life and stability of operation in the high temperature environment is essential for the temperature measurement system to ensure the continuous running of the coal gasification system over the long term. In this high temperature and chemically corrosive environment, rather limited high temperature measurement techniques such as high temperature thermocouples and optical/acoustic pyrometers are available, each with their own limitations. In this research program, five different temperature sensing schemes based on the single crystal sapphire

  1. [Gemology characterization and identification of beryllium diffused, heated and untreated bicolor sapphires from Changle City, China].

    PubMed

    Chen, Tao; Yang, Ming-xing

    2012-03-01

    Be-diffused, heated and untreated bicolor sapphires (blue and yellow) from Changle City, Shandong Province, China were studied by using standard gemological methods, ultraviolet-visible (UV-Vis) spectroscopy, infrared (IR) spectroscopy, electron microprobe, and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) to obtain the spectra characterization, and to suggest identification methods for them. Only Fe(3+)-Fe3+ absorption bands formed in ultraviolet region appear in Be-diffused bicolor sapphire, which is especially strong at 377 nm. In IR absorption spectra, absorption peak at 3 310 cm(-1) appears in heated and untreated bicolor sapphires, while it disappears in Be-diffused bicolor sapphire. Therefore, UV-Vis and IR absorption spectra can be used to identify Be-diffused, heated and untreated bicolor sapphires. On the other hand, methylene iodide immersion observation also can be used to identify Be-diffused bicolor sapphire. PMID:22582625

  2. [Gemology characterization and identification of beryllium diffused, heated and untreated bicolor sapphires from Changle City, China].

    PubMed

    Chen, Tao; Yang, Ming-xing

    2012-03-01

    Be-diffused, heated and untreated bicolor sapphires (blue and yellow) from Changle City, Shandong Province, China were studied by using standard gemological methods, ultraviolet-visible (UV-Vis) spectroscopy, infrared (IR) spectroscopy, electron microprobe, and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) to obtain the spectra characterization, and to suggest identification methods for them. Only Fe(3+)-Fe3+ absorption bands formed in ultraviolet region appear in Be-diffused bicolor sapphire, which is especially strong at 377 nm. In IR absorption spectra, absorption peak at 3 310 cm(-1) appears in heated and untreated bicolor sapphires, while it disappears in Be-diffused bicolor sapphire. Therefore, UV-Vis and IR absorption spectra can be used to identify Be-diffused, heated and untreated bicolor sapphires. On the other hand, methylene iodide immersion observation also can be used to identify Be-diffused bicolor sapphire.

  3. Step-Edge-Guided Nucleation and Growth of Aligned WSe2 on Sapphire via a Layer-over-Layer Growth Mode.

    PubMed

    Chen, Liang; Liu, Bilu; Ge, Mingyuan; Ma, Yuqiang; Abbas, Ahmad N; Zhou, Chongwu

    2015-08-25

    Two-dimensional (2D) materials beyond graphene have drawn a lot of attention recently. Among the large family of 2D materials, transitional metal dichalcogenides (TMDCs), for example, molybdenum disulfides (MoS2) and tungsten diselenides (WSe2), have been demonstrated to be good candidates for advanced electronics, optoelectronics, and other applications. Growth of large single-crystalline domains and continuous films of monolayer TMDCs has been achieved recently. Usually, these TMDC flakes nucleate randomly on substrates, and their orientation cannot be controlled. Nucleation control and orientation control are important steps in 2D material growth, because randomly nucleated and orientated flakes will form grain boundaries when adjacent flakes merge together, and the formation of grain boundaries may degrade mechanical and electrical properties of as-grown materials. The use of single crystalline substrates enables the alignment of as-grown TMDC flakes via a substrate-flake epitaxial interaction, as demonstrated recently. Here we report a step-edge-guided nucleation and growth approach for the aligned growth of 2D WSe2 by a chemical vapor deposition method using C-plane sapphire as substrates. We found that at temperatures above 950 °C the growth is strongly guided by the atomic steps on the sapphire surface, which leads to the aligned growth of WSe2 along the step edges on the sapphire substrate. In addition, such atomic steps facilitate a layer-over-layer overlapping process to form few-layer WSe2 structures, which is different from the classical layer-by-layer mode for thin-film growth. This work introduces an efficient way to achieve oriented growth of 2D WSe2 and adds fresh knowledge on the growth mechanism of WSe2 and potentially other 2D materials. PMID:26221865

  4. Step-Edge-Guided Nucleation and Growth of Aligned WSe2 on Sapphire via a Layer-over-Layer Growth Mode.

    PubMed

    Chen, Liang; Liu, Bilu; Ge, Mingyuan; Ma, Yuqiang; Abbas, Ahmad N; Zhou, Chongwu

    2015-08-25

    Two-dimensional (2D) materials beyond graphene have drawn a lot of attention recently. Among the large family of 2D materials, transitional metal dichalcogenides (TMDCs), for example, molybdenum disulfides (MoS2) and tungsten diselenides (WSe2), have been demonstrated to be good candidates for advanced electronics, optoelectronics, and other applications. Growth of large single-crystalline domains and continuous films of monolayer TMDCs has been achieved recently. Usually, these TMDC flakes nucleate randomly on substrates, and their orientation cannot be controlled. Nucleation control and orientation control are important steps in 2D material growth, because randomly nucleated and orientated flakes will form grain boundaries when adjacent flakes merge together, and the formation of grain boundaries may degrade mechanical and electrical properties of as-grown materials. The use of single crystalline substrates enables the alignment of as-grown TMDC flakes via a substrate-flake epitaxial interaction, as demonstrated recently. Here we report a step-edge-guided nucleation and growth approach for the aligned growth of 2D WSe2 by a chemical vapor deposition method using C-plane sapphire as substrates. We found that at temperatures above 950 °C the growth is strongly guided by the atomic steps on the sapphire surface, which leads to the aligned growth of WSe2 along the step edges on the sapphire substrate. In addition, such atomic steps facilitate a layer-over-layer overlapping process to form few-layer WSe2 structures, which is different from the classical layer-by-layer mode for thin-film growth. This work introduces an efficient way to achieve oriented growth of 2D WSe2 and adds fresh knowledge on the growth mechanism of WSe2 and potentially other 2D materials.

  5. Ultrathin Films of VO2 on r-Cut Sapphire Achieved by Postdeposition Etching.

    PubMed

    Yamin, Tony; Wissberg, Shai; Cohen, Hagai; Cohen-Taguri, Gili; Sharoni, Amos

    2016-06-15

    The metal-insulator transition (MIT) properties of correlated oxides thin films, such as VO2, are dramatically affected by strain induced at the interface with the substrate, which usually changes with deposition thickness. For VO2 grown on r-cut sapphire, there is a minimum deposition thickness required for a significant MIT to appear, around 60 nm. We show that in these thicker films an interface layer develops, which accompanies the relaxation of film strain and enhanced electronic transition. If these interface dislocations are stable at room temperature, we conjectured, a new route opens to control thickness of VO2 films by postdeposition thinning of relaxed films, overcoming the need for thickness-dependent strain-engineered substrates. This is possible only if thinning does not alter the films' electronic properties. We find that wet etching in a dilute NaOH solution can effectively thin the VO2 films, which continue to show a significant MIT, even when etched to 10 nm, for which directly deposited films show nearly no transition. The structural and chemical composition were not modified by the etching, but the grain size and film roughness were, which modified the hysteresis width and magnitude of the MIT resistance change.

  6. Efficient evaluation of epitaxial MoS2 on sapphire by direct band structure imaging

    NASA Astrophysics Data System (ADS)

    Kim, Hokwon; Dumcenco, Dumitru; Fregnaux, Mathieu; Benayad, Anass; Kung, Yen-Cheng; Kis, Andras; Renault, Olivier; Lanes Group, Epfl Team; Leti, Cea Team

    The electronic band structure evaluation of two-dimensional metal dichalcogenides is critical as the band structure can be greatly influenced by the film thickness, strain, and substrate. Here, we performed a direct measurement of the band structure of as-grown monolayer MoS2 on single crystalline sapphire by reciprocal-space photoelectron emission microscopy with a conventional laboratory ultra-violet He I light source. Arrays of gold electrodes were deposited onto the sample in order to avoid charging effects due to the insulating substrate. This allowed the high resolution mapping (ΔE = 0.2 eV Δk = 0.05 Å-1) of the valence states in momentum space down to 7 eV below the Fermi level. The high degree of the epitaxial alignment of the single crystalline MoS2 nuclei was verified by the direct momentum space imaging over a large area containing multiple nuclei. The derived values of the hole effective mass were 2.41 +/-0.05 m0 and 0.81 +/-0.05 m0, respectively at Γ and K points, consistent with the theoretical values of the freestanding monolayer MoS2 reported in the literature. HK acknowledges the french CEA Basic Technological Research program (RTB) for funding.

  7. Inclined angle-controlled growth of GaN nanorods on m-sapphire by metal organic chemical vapor deposition without a catalyst.

    PubMed

    Lee, Kyuseung; Chae, Sooryong; Jang, Jongjin; Min, Daehong; Kim, Jaehwan; Eom, Daeyong; Yoo, Yang-Seok; Cho, Yong-Hoon; Nam, Okhyun

    2015-08-21

    In this study, we have intentionally grown novel types of (11-22)- and (1-10-3)-oriented(3) and self-assembled inclined GaN nanorods (NRs) on (10-10) m-sapphire substrates using metal organic chemical vapor deposition without catalysts and ex situ patterning. Nitridation of the m-sapphire surface was observed to be crucial to the inclined angle as well as the growth direction of the GaN NRs. Polarity-selective KOH etching confirmed that both (11-22) and (1-10-3) GaN NRs are nitrogen-polar. Using pole figure measurements and selective area electron diffraction patterns, the epitaxial relationship between the inclined (11-22) and (1-10-3) GaN NRs and m-sapphire substrates was systematically demonstrated. Furthermore, it was verified that the GaN NRs were single-crystalline wurtzite structures. We observed that stacking fault-related defects were generated during the initial growth stage using high-resolution transmission electron microscopy. The blue-shift of the near band edge (NBE) peak in the inclined angle-controlled GaN NRs can be explained by a band filling effect through carrier saturation of the conduction band, resulting from a high Si-doping concentration; in addition, the decay time of NBE emission in (11-22)- and (1-10-3)-oriented NRs was much shorter than that of stacking fault-related emission. These results suggest that defect-free inclined GaN NRs can be grown on m-sapphire without ex situ treatment.

  8. Ga/Mg ratio as a new geochemical tool to differentiate magmatic from metamorphic blue sapphires

    NASA Astrophysics Data System (ADS)

    Peucat, J. J.; Ruffault, P.; Fritsch, E.; Bouhnik-Le Coz, M.; Simonet, C.; Lasnier, B.

    2007-10-01

    Using ICP-MS-LA analyses, we demonstrate that the use of the Ga/Mg ratio, in conjunction with the Fe concentration, is an efficient tool in discriminating between "metamorphic" and "magmatic" blue sapphires. Magmatic blue sapphires found in alkali basalts (e.g. southeastern Asia, China, Africa) are commonly medium-rich to rich in Fe (with average contents between 2000 and 11000 ppm), high in Ga (> 140 ppm), and low in Mg (generally < 20 ppm) with high Ga/Mg ratios (> 10). Conversely, metamorphic blue sapphires found in basalts (e.g. Pailin pastel) and in metamorphic terrains (e.g. Mogok, Sri Lanka, Ilakaka) are characterized by low average iron contents (< 3000 ppm), low Ga contents (< 75 ppm), and high Mg values (> 60 ppm) with low average Ga/Mg ratios (< 10). Basaltic magmatic sapphires have Fe, Ga and Mg contents similar to those obtained for primary magmatic sapphires found in the Garba Tula syenite. This suggests that these both sets of sapphires have a possible common "syenitic" origin, as previously proposed from other criteria. In addition, plumasite-related sapphires and metamorphic sapphires also exhibit similar composition in trace elements. Based on results from the present study, we suggest that fluid circulations during a metamorphic stage produced metasomatic exchanges between mafic and acidic rocks (plumasite model), thus explaining the high Mg contents and converging Ga/Mg ratios observed in metamorphic sapphires.

  9. Detection of beryllium treatment of natural sapphires by NRA

    NASA Astrophysics Data System (ADS)

    Gutiérrez, P. C.; Ynsa, M.-D.; Climent-Font, A.; Calligaro, T.

    2010-06-01

    Since the 1990's, artificial treatment of natural sapphires (Al 2O 3 crystals coloured by impurities) by diffusion of beryllium at high temperature has become a growing practice. This process permits to enhance the colour of these gemstones, and thus to increase their value. Detection of such a treatment - diffusion of tens of μg/g of beryllium in Al 2O 3 crystals - is usually achieved using high sensitivity techniques like laser-ablation inductively coupled plasma mass spectrometry (LA-ICP/MS) or laser-induced breakdown spectrometry (LIBS) which are unfortunately micro-destructive (leaving 50-100-μm diameter craters on the gems). The simple and non-destructive alternative method proposed in this work is based on the nuclear reaction 9Be(α, nγ) 12C with an external helium ion beam impinging on the gem directly placed in air. The 4439 keV prompt γ-ray tagging Be atoms are detected with a high efficiency bismuth germanate scintillator. Beam dose is monitored using the 2235 keV prompt γ-ray produced during irradiation by the aluminium of the sapphire matrix through the 27Al(α, pγ) 30Si nuclear reaction. The method is tested on a series of Be-treated sapphires previously analyzed by LA-ICP/MS to determine the optimal conditions to obtain a peak to background appropriate to reach the required μg/g sensitivity. Using a 2.8-MeV external He beam and a beam dose of 200 μC, beryllium concentrations from 5 to 16 μg/g have been measured in the samples, with a detection limit of 1 μg/g.

  10. Methodology of growing gigantic sapphire for GSLW project

    NASA Astrophysics Data System (ADS)

    Abgaryan, Artoush A.; Hartounian, Gomidas

    2005-09-01

    In our present world the Crystal Growth Technology does not have the necessary and sufficient conditions to manufacture large sizes; especially in the Sapphire Crystal world. We have a theoretical and methodological development for growing gigantic Sapphire Crystal Lenses. Our gigantic Sapphire Crystal Lenses have a unique optical characteristic which will be used in the Global System of Laser Weapons (GSLW); hence solving one of the crucial problems in the Relay Mirror System; where it captures the Laser beam from the earth surface, cleaning the beam in the Satellite and redirecting the laser energy to the precise desired target. Developed and solution for the temperature and heat-elasticity fields in growth systems are considered theoretical, in order to assess their effects on the optical symmetry of the growing crystal. The process is modeled using three-dimensional curvilinear coordinates to describe a closed, low-strain heat-elasticity system, with allowance made for the temperature variations of the thermal properties of the multilayer growth system, and nonlinear and unsteady-state process with arbitrary boundary conditions. The results presented as plots of the strain, stress, displacement, and temperature fields; demonstrate the potential of the method for designing new growth units and improving the existing ones and suggesting that crystals, in general, without frustration of optical symmetry can, in principle, be grown. In order to solve generalized problem for large optics. It is required to have super and correct mathematical computing calculations, and using basic fundamental laws of nature regarding optical symmetry in the crystal, and discovering the radical "new wave method" for crystal growth technology.

  11. Designable buried waveguides in sapphire by proton implantation

    SciTech Connect

    Laversenne, L.; Hoffmann, P.; Pollnau, M.; Moretti, P.; Mugnier, J.

    2004-11-29

    Buried and stacked planar as well as buried single and parallel channel waveguides are fabricated in sapphire by proton implantation. Good control of the implantation parameters provides excellent confinement of the guided light in each structure. Low propagation losses are obtained in fundamental-mode, buried channel waveguides without postimplantation annealing. Choice of the implantation parameters allows one to design mode shapes with different ellipticity and/or mode asymmetry in each orthogonal direction, thus demonstrating the versatility of the fabrication method. Horizontal and vertical parallelization is demonstrated for the design of one- or two-dimensional waveguide arrays in hard crystalline materials.

  12. Cost effective fabrication method for large sapphire sensor windows

    NASA Astrophysics Data System (ADS)

    Walters, Mark; Gould, Alan; Bartlett, Kevin; Brophy, Matthew R.; DeGroote Nelson, Jessica

    2013-09-01

    Sapphire poses very difficult challenges to optical manufacturers due to its high hardness and anisotropic properties. These challenges can result in long lead times and high prices. Large optical sensor windows demand much higher precision surfaces compared to transparent armor (windshields) to achieve acceptable image quality. Optimax is developing a high speed, cost effective process to produce such windows. The Optimax high speed process is a two-step process that combines precision fixed abrasive grinding and high speed polishing. In-house studies have demonstrated cycle time reduction of up to 6X as compared to conventional processing.

  13. cw passive mode locking of a Ti:sapphire laser

    SciTech Connect

    Sarukura, N.; Ishida, Y.; Nakano, H.; Yamamoto, Y. )

    1990-02-26

    cw passive mode locking of a Ti:sapphire laser is achieved with 1,1{prime}-dietyl-2,2{prime}-dicarbocyanine iodide as the saturable absorber dye, using a 5 {mu}m thin dye jet flow. The pulse width is 4.0 ps, which is almost the transform-limited pulse for the observed spectrum width. The output power is {similar to}50 mW, when it is pumped by a 5 W cw Ar laser, while the tuning range is 745--755 nm.

  14. Injection mode-locking Ti-sapphire laser system

    DOEpatents

    Hovater, James Curtis; Poelker, Bernard Matthew

    2002-01-01

    According to the present invention there is provided an injection modelocking Ti-sapphire laser system that produces a unidirectional laser oscillation through the application of a ring cavity laser that incorporates no intracavity devices to achieve unidirectional oscillation. An argon-ion or doubled Nd:YVO.sub.4 laser preferably serves as the pump laser and a gain-switched diode laser serves as the seed laser. A method for operating such a laser system to produce a unidirectional oscillating is also described.

  15. (abstract) Epitaxial High-T(sub c) SNS Weak Links on Silicon-on-Sapphire Substrates

    NASA Technical Reports Server (NTRS)

    Hunt, B. D.; Barner, J. B.; Foote, M. C.; Vasquez, R. P.; Schoelkopf, R. J.; Phillips, T. G.; Zmuidzinas, J.

    1994-01-01

    High-T(sub c) SNS weak links are expected to prove useful as high frequency sources and detectors. Recent studies with low-T(sub c) Josephson mixers using shunted tunnel junctions at 100 GHz show good initial performance, and modeling suggests that these results should extrapolate to higher frequencies if larger I(sub c)R(sub n) products can be achieved. Progress on this work will be reported.

  16. Semipolar and nonpolar GaN epi-films grown on m-sapphire by plasma assisted molecular beam epitaxy

    SciTech Connect

    Mukundan, Shruti; Mohan, Lokesh; Chandan, Greeshma; Krupanidhi, S. B.; Roul, Basanta

    2014-11-28

    We hereby report the development of non-polar epi-GaN films of usable quality, on an m-plane sapphire. Generally, it is difficult to obtain high-quality nonpolar material due to the planar anisotropic nature of the growth mode. However, we could achieve good quality epi-GaN films by involving controlled steps of nitridation. GaN epilayers were grown on m-plane (10-10) sapphire substrates using plasma assisted molecular beam epitaxy. The films grown on the nitridated surface resulted in a nonpolar (10-10) orientation while without nitridation caused a semipolar (11-22) orientation. Room temperature photoluminescence study showed that nonpolar GaN films have higher value of compressive strain as compared to semipolar GaN films, which was further confirmed by room temperature Raman spectroscopy. The room temperature UV photodetection of both films was investigated by measuring the I-V characteristics under UV light illumination. UV photodetectors fabricated on nonpolar GaN showed better characteristics, including higher external quantum efficiency, compared to photodetectors fabricated on semipolar GaN. X-ray rocking curves confirmed better crystallinity of semipolar as compared to nonpolar GaN which resulted in faster transit response of the device.

  17. Frequency Stability of 1X10(sup -13) in a Compensated Sapphire Oscillator Operating Above 77 K

    NASA Technical Reports Server (NTRS)

    Santiago, D. G.; Dick, G. J.; Wang, R. T.

    1996-01-01

    We report on a frequency-stable temperature compensated sapphire oscillator (CSO) at temperatures above 77 K. Previously, high stability in sapphire oscillators had only been obtained with liquid helium cooling.

  18. Effect of Charging Electron Exposure on 1064nm Transmission through Bare Sapphire Optics and SiO2 over HfO2 AR-coated Sapphire Optics

    NASA Technical Reports Server (NTRS)

    Ottens, Brian P.; Connelly, Joseph; Brown, Stephen; Roeder, james; Kauder, Lonny; Cavanaugh, John

    2008-01-01

    Experiments measuring the effect of electron exposure on 1064nm transmission for optical sapphire were conducted. Detailed before and after inspections did not identify any resulting Litchenburg patterns. Pre- and post-exposure 1064nm transmission measurements are compared.

  19. Effect of Charging Electron Exposure on 1064nm Transmission Through Bare Sapphire Optics and SiO2 over HfO2 AR-Coated Sapphire Optics

    NASA Technical Reports Server (NTRS)

    Ottens, Brian P.; Connelly, Joseph; Brown, Stephen; Roeder, James; Kauder, Lonny; Cavanaugh, John

    2010-01-01

    Experiments measuring the effect of electron exposure on 1064nm transmission for optical sapphire were conducted. Detailed before and after inspections did not identify any resulting Litchenburg patterns. Pre- and post-exposure 1064nm transmission measurements are compared.

  20. Epitaxial growth of In{sub x}Ga{sub 1-x}N alloy films on sapphire and silicon by reactive co-sputtering of GaAs and indium

    SciTech Connect

    Mohan, Shyam Major, S. S.; Srinivasa, R. S.

    2015-06-24

    In{sub x}Ga{sub 1-x}N alloy films (0.2sapphire and Si (100) substrates by reactive co-sputtering of GaAs and indium with 100% nitrogen at a substrate temperature of 600 °C. X-ray diffraction studies show the formation of completely c-axis oriented, single phase alloy films over the studied range of composition. The crystallite size along the growth direction and surface morphology of alloy films, particularly those with higher indium fraction exhibit substantial improvement on Si (100) substrate, compared to the c-cut sapphire substrate. The electrical resistivity decreases monotonously with increase in indium fraction and the alloy films on Si (100) show substantially higher mobility, compared to those on sapphire. These features are attributed to superior crystallinity of alloy films on Si (100), which possibly arise from the formation of interfacial hexagonal α-Si{sub 3}N{sub 4}, owing to the interaction of nitrogen plasma with Si surface.

  1. Analysis and modification of blue sapphires from Rwanda by ion beam techniques

    NASA Astrophysics Data System (ADS)

    Bootkul, D.; Chaiwai, C.; Tippawan, U.; Wanthanachaisaeng, B.; Intarasiri, S.

    2015-12-01

    Blue sapphire is categorised in a corundum (Al2O3) group. The gems of this group are always amazed by their beauties and thus having high value. In this study, blue sapphires from Rwanda, recently came to Thai gemstone industry, are chosen for investigations. On one hand, we have applied Particle Induced X-ray Emission (PIXE), which is a highly sensitive and precise analytical technique that can be used to identify and quantify trace elements, for chemical analysis of the sapphires. Here we have found that the major element of blue sapphires from Rwanda is Al with trace elements such as Fe, Ti, Cr, Ga and Mg as are commonly found in normal blue sapphire. On the other hand, we have applied low and medium ion implantations for color improvement of the sapphire. It seems that a high amount of energy transferring during cascade collisions have altered the gems properties. We have clearly seen that the blue color of the sapphires have been intensified after nitrogen ion bombardment. In addition, the gems were also having more transparent and luster. The UV-Vis-NIR measurement detected the modification of their absorption properties, implying of the blue color increasing. Here the mechanism of these modifications is postulated and reported. In any point of view, the bombardment by using nitrogen ion beam is a promising technique for quality improvement of the blue sapphire from Rwanda.

  2. Optical Extinction of Sapphire Shock Loaded to 250-260 GPa

    SciTech Connect

    Hare, D E; Webb, D J; Lee, S H; Holmes, N

    2001-08-21

    Sapphire, a common optical window material used in shock-compression studies, displays significant shock-induced optical emission and extinction. It is desirable to quantify such non-ideal window behavior to enhance the usefulness of sapphire in optical studies of opaque shock-compressed samples, such as metals. At the highest stresses we can achieve with a two-stage gas gun it is technically very difficult to study the optical properties of sapphire without the aid of some opaque backing material, hence one is invariably compelled to deconvolve the optical effects of the opaque surface and the sapphire. In an effort to optimize this deconvolution process, we have constructed sapphire/thin-film/sapphire samples using two basic types of thin films: one optimized to emit copious optical radiation (the hot-film sample), the other designed to yield minimal emission (the cold-film sample). This sample geometry makes it easy to maintain the same steady shock-stress in the sapphire window (255 GPa in our case) while varying the window/film interface temperature. A six-channel time-resolved optical pyrometer is used to measure the emission from the sample assemblies. Two different sapphire crystal orientations were evaluated. We also comment on finite thermal conductivity effects of the thin-film geometry on the interpretation of our data.

  3. Clinical evaluation of a single crystal sapphire tooth implant in human beings.

    PubMed

    Sclaroff, A; el-Mofty, S; Guyer, S E

    1990-08-01

    Single crystal sapphire implants are commercially prepared ceramics of aluminum oxide. These endosseous implants have been placed in patients at Washington University since 1978. The course of patients has been followed closely with periodic clinical and radiographic evaluations. Sapphire is well tolerated by hard and soft tissue and provides excellent abutments for fixed partial dentures.

  4. Temperature measurement of substrate with a thin film using low-coherence interference

    NASA Astrophysics Data System (ADS)

    Tsutsumi, Takayoshi; Hiraoka, Takehiro; Takeda, Keigo; Ishikawa, Kenji; Kondo, Hiroki; Ohta, Takayuki; Ito, Masafumi; Sekine, Makoto; Hori, Masaru

    2012-10-01

    In plasma etching or plasma CVD, substrate temperature is one of the most important factors which determine the process performances. Non-contact temperature measurement technology is preferred for the fabrication of electric devices because of avoiding contamination and improving reliability. We have developed a highly precise and non-contact temperature monitor using a Fourier domain low-coherence interferometer (FD-LCI) and a super luminescent diode (SLD; center wavelength: 1330 nm, spectral width: 37.6 nm) as a low coherence light source. The temperature is derived from the changes of optical path length in substrate, which occurred by thermal expansion and refractive-index change. We achieved to estimate the Si wafer temperature during a plasma exposure. However, it is necessary to measure a substrate with thin films and/or other material substrate such as sapphire. In this report, we applied the monitor to Si wafer with carbon nanowalls and a sapphire substrate with GaN. While on heating the substrate, the optical path length increased linearly, and it turned out that non-contact measurement of substrate with a thin film could be realized for Si and sapphire substrates. [4pt] [1] T. Tsutsumi et al: ISPlasma2011, P1-002A, Nagoya, Japan, (March 2011).

  5. Holographic fabrication of gratings in metal substrates

    NASA Technical Reports Server (NTRS)

    Fletcher, R. M.; Wagner, D. K.; Ballantyne, J. M.

    1982-01-01

    A program for investigating the grain enlargement resulting from the laser recrystallization of a thin gallium arsenide film on a patterned substrate, a technique known as graphoepitaxy was evaluated. More specifically, the effects of recrystallizing an uncapped gallium arsenide film using a continuous wave neodymium YAG laser operating at 1.06 microns were studied. In an effort to minimize arsenic loss from the film, the specimens were held in an arsine atmosphere during recrystallization. Two methods for fabricating patterned substrates were developed, one using reactive ion etching of a molybdenum film on both sapphire and silicon substates and another by preferential wet etching of a silicon substrate onto which a film of molybdenum was subsequently deposited.

  6. Electron induced surface chemistry at the Cs/sapphire interface

    SciTech Connect

    Zavadil, K.R.; Ing, J.L.

    1995-11-01

    Electron induced etching of sapphire in the presence of Cs has been studied using a variety of surface analytical techniques. We find that this process occurs on both the (0001) and (1102) orientations of sapphire. Monolayer amounts of Al and sub-oxides of Al are thermally desorbed from the surface at temperatures as low as 1000 K when the surface is irradiated with electrons in the presence of Cs. Etching is highly dependent on Cs coverage with the (0001) and (1102) surfaces requiring 2.0 {times} 10{sup 14} and 3.4 {times} 10{sup 14} atoms/cm{sup 2} to support etching, respectively. Adsorption profiles demonstrate that these coverages correspond to initial saturation of the surface with Cs. Electron damage of the surface in the absence of Cs also produces desorption of Al and sub-oxides of Al indicating a possible mechanism for etching. The impact of etching on the surface is to increase the adsorption capacity on the (0001) surface while decreasing both initial adsorption probability and capacity on the (1102) surface.

  7. Temperature behavior of damage in sapphire implanted with light ions

    NASA Astrophysics Data System (ADS)

    Alves, E.; Marques, C.; Sáfrán, G.; McHargue, Carl J.

    2009-05-01

    In this study, we compare and discuss the defect behavior of sapphire single crystals implanted with different fluences (1 × 1016-1 × 1017 cm-2) of carbon and nitrogen with 150 keV. The implantation temperatures were RT, 500 °C and 1000 °C to study the influence of temperature on the defect structures. For all the ions the Rutherford backscattering-channeling (RBS-C) results indicate a surface region with low residual disorder in the Al-sublattice. Near the end of range the channeled spectrum almost reaches the random indicating a high damage level for fluences of 1 × 1017 cm-2. The transmission electron microscopy (TEM) photographs show a layered contrast feature for the C implanted sample where a buried amorphous region is present. For the N implanted sample the Electron Energy Loss Spectroscopy (EELS) elemental mapping give evidence for the presence of a buried damage layer decorated with bubbles. Samples implanted at high temperatures (500 °C and 1000 °C) show a strong contrast fluctuation indicating a defective crystalline structure of sapphire.

  8. The SAPPHIRE trial: investigations on angular deviation caused by refraction

    NASA Astrophysics Data System (ADS)

    Stein, Karin; Seiffer, Dirk

    2007-10-01

    The NATO Panel SET-088 TG-51 has the charter to investigate infrared research topics relating to Littoral Ship Self-Defence. The two main research areas for TG-51 are low-altitude maritime IR propagation phenomenology and ship signature properties. Atmospheric scintillation and refraction prediction models were validated in several trials conducted by different NATO groups. So far most trials were conducted in cold waters. In June 2006, TG 51 performed the SAPPHIRE trial (Ship and Atmospheric Propagation PHenomenon InfraRed Experiment) to collect data in littoral areas under conditions of warm sea temperatures. The location of the trial was the US Naval Research Laboratory's Chesapeake Bay Detachment (CBD) field site on Chesapeake Bay. The objectives of the trial were to validate ship signature models and scintillation/refraction models. In the SAPPHIRE trial, the purpose of FGAN-FOM was to investigate the influence of changing weather conditions on the apparent elevation of a target. Therefore, we set up an IR-camera at CBD overlooking Chesapeake Bay observing a set of lights installed on an Island in 16 km distance. In this paper we discuss and analyse the measured elevations and compare them to the propagation model IRBLEM (IR Boundary Layer Effects Model) by DRDC, Canada.

  9. The effect of zirconium implantation on the structure of sapphire

    SciTech Connect

    Sina, Younes; McHargue, Carl J; Duscher, Gerd; Zhang, Yanwen

    2012-01-01

    The effect of zirconium implantation on the structure of sapphire was investigated by 175 keV Zr implantation at room temperature to a fluence of 4 1016 ions/cm2 into sapphire single crystals. Samples were examined by several experimental techniques: Rutherford backscattering spectroscopy along a channeling direction (RBS-C), electron-energy loss spectroscopy (EELS), and Z-contrast images obtained in an aberration-corrected scanning transmission electron microscope. Range and deposited energy were simulated with SRIM-2008.04. The Z-contrast images from transmission electron microscope indicated: a near surface damaged layer ~30 nm thick, a subsurface region exhibiting "random" de-channeling ~52 nm thick, and a deeper damaged, crystalline zone ~64 nm thick. The RBS-C spectra confirmed the presence of these three regions. The two damaged regions contained high concentrations of as yet unresolved defect clusters. The intermediate region contained Zr-clusters embedded in an "amorphous" matrix that exhibited short-range order corresponding to -Al2O3, i.e., a defective spinel structure. The EELS measurements show that the amorphous region is deficient in oxygen.

  10. Characterization of sapphire: For its material properties at high temperatures

    NASA Astrophysics Data System (ADS)

    Bal, Harman Singh

    There are numerous needs for sensing, one of which is in pressure sensing for high temperature application such as combustion related process and embedded in aircraft wings for reusable space vehicles. Currently, silicon based MEMS technology is used for pressure sensing. However, due to material properties the sensors have a limited range of approximately 600 °C which is capable of being pushed towards 1000 °C with active cooling. This can introduce reliability issues when you add more parts and high flow rates to remove large amounts of heat. To overcome this challenge, sapphire is investigated for optical based pressure transducers at temperatures approaching 1400 °C. Due to its hardness and chemical inertness, traditional cutting and etching methods used in MEMS technology are not applicable. A method that is being investigated as a possible alternative is laser machining using a picosecond laser. In this research, we study the material property changes that occur from laser machining and quantify the changes with the experimental results obtained by testing sapphire at high-temperature with a standard 4-point bending set-up.

  11. Photoluminescence from CdTe/sapphire films prepared by molecular beam epitaxy

    NASA Astrophysics Data System (ADS)

    Edwards, S. T.; Schreiner, A. F.; Myers, T. M.; Schetzina, J. F.

    1983-11-01

    Photoluminescence studies at 77 K are reported for CdTe/sapphire films prepared by molecular beam epitaxy. The CdTe/sapphire epilayers exhibited very bright photoluminescence spectra that were dominated by the near-edge emission band at 1.58 eV. The best CdTe/sapphire film proved to be the brightest source of luminescence of any CdTe specimen studied in our laboratories, including homoepitaxial films and bulk hydroplane polished samples. The CdTe/sapphire films also exhibited the best lateral uniformity as manifested by a nearly constant luminescence intensity over their surfaces. These results provide new evidence that high quality CdTe epitaxy on sapphire has been achieved.

  12. Femtosecond laser-induced periodic surface structural formation on sapphire with nanolayered gold coating

    NASA Astrophysics Data System (ADS)

    Yin, Kai; Wang, Cong; Duan, Ji'an; Guo, Chunlei

    2016-09-01

    Sapphire has a potential as a new generation of electronics display. However, direct processing of sapphire surface by visible or near-IR laser light is challenging since sapphire is transparent to these wavelengths. In this study, we investigate the formation of femtosecond laser-induced periodic surface structures (LIPSSs) on sapphire coated with nanolayered gold film. We found a reduced threshold by about 25 % in generating uniform LIPSSs on sapphire due to the nanolayered gold film. Different thickness of nanolayered gold films are studied, and it is shown that the change in thickness does not significantly affect the threshold reduction. It is believed that the diffusion of hot electrons in the gold films increases interfacial carrier density and electron-phonon coupling that results in a reduced threshold and more uniform periodic surface structure generation.

  13. Atomic Step Formation on Sapphire Surface in Ultra-precision Manufacturing

    NASA Astrophysics Data System (ADS)

    Wang, Rongrong; Guo, Dan; Xie, Guoxin; Pan, Guoshun

    2016-07-01

    Surfaces with controlled atomic step structures as substrates are highly relevant to desirable performances of materials grown on them, such as light emitting diode (LED) epitaxial layers, nanotubes and nanoribbons. However, very limited attention has been paid to the step formation in manufacturing process. In the present work, investigations have been conducted into this step formation mechanism on the sapphire c (0001) surface by using both experiments and simulations. The step evolutions at different stages in the polishing process were investigated with atomic force microscopy (AFM) and high resolution transmission electron microscopy (HRTEM). The simulation of idealized steps was constructed theoretically on the basis of experimental results. It was found that (1) the subtle atomic structures (e.g., steps with different sawteeth, as well as steps with straight and zigzag edges), (2) the periodicity and (3) the degree of order of the steps were all dependent on surface composition and miscut direction (step edge direction). A comparison between experimental results and idealized step models of different surface compositions has been made. It has been found that the structure on the polished surface was in accordance with some surface compositions (the model of single-atom steps: Al steps or O steps).

  14. Atomic Step Formation on Sapphire Surface in Ultra-precision Manufacturing.

    PubMed

    Wang, Rongrong; Guo, Dan; Xie, Guoxin; Pan, Guoshun

    2016-07-22

    Surfaces with controlled atomic step structures as substrates are highly relevant to desirable performances of materials grown on them, such as light emitting diode (LED) epitaxial layers, nanotubes and nanoribbons. However, very limited attention has been paid to the step formation in manufacturing process. In the present work, investigations have been conducted into this step formation mechanism on the sapphire c (0001) surface by using both experiments and simulations. The step evolutions at different stages in the polishing process were investigated with atomic force microscopy (AFM) and high resolution transmission electron microscopy (HRTEM). The simulation of idealized steps was constructed theoretically on the basis of experimental results. It was found that (1) the subtle atomic structures (e.g., steps with different sawteeth, as well as steps with straight and zigzag edges), (2) the periodicity and (3) the degree of order of the steps were all dependent on surface composition and miscut direction (step edge direction). A comparison between experimental results and idealized step models of different surface compositions has been made. It has been found that the structure on the polished surface was in accordance with some surface compositions (the model of single-atom steps: Al steps or O steps).

  15. Atomic Step Formation on Sapphire Surface in Ultra-precision Manufacturing.

    PubMed

    Wang, Rongrong; Guo, Dan; Xie, Guoxin; Pan, Guoshun

    2016-01-01

    Surfaces with controlled atomic step structures as substrates are highly relevant to desirable performances of materials grown on them, such as light emitting diode (LED) epitaxial layers, nanotubes and nanoribbons. However, very limited attention has been paid to the step formation in manufacturing process. In the present work, investigations have been conducted into this step formation mechanism on the sapphire c (0001) surface by using both experiments and simulations. The step evolutions at different stages in the polishing process were investigated with atomic force microscopy (AFM) and high resolution transmission electron microscopy (HRTEM). The simulation of idealized steps was constructed theoretically on the basis of experimental results. It was found that (1) the subtle atomic structures (e.g., steps with different sawteeth, as well as steps with straight and zigzag edges), (2) the periodicity and (3) the degree of order of the steps were all dependent on surface composition and miscut direction (step edge direction). A comparison between experimental results and idealized step models of different surface compositions has been made. It has been found that the structure on the polished surface was in accordance with some surface compositions (the model of single-atom steps: Al steps or O steps). PMID:27444267

  16. Atomic Step Formation on Sapphire Surface in Ultra-precision Manufacturing

    PubMed Central

    Wang, Rongrong; Guo, Dan; Xie, Guoxin; Pan, Guoshun

    2016-01-01

    Surfaces with controlled atomic step structures as substrates are highly relevant to desirable performances of materials grown on them, such as light emitting diode (LED) epitaxial layers, nanotubes and nanoribbons. However, very limited attention has been paid to the step formation in manufacturing process. In the present work, investigations have been conducted into this step formation mechanism on the sapphire c (0001) surface by using both experiments and simulations. The step evolutions at different stages in the polishing process were investigated with atomic force microscopy (AFM) and high resolution transmission electron microscopy (HRTEM). The simulation of idealized steps was constructed theoretically on the basis of experimental results. It was found that (1) the subtle atomic structures (e.g., steps with different sawteeth, as well as steps with straight and zigzag edges), (2) the periodicity and (3) the degree of order of the steps were all dependent on surface composition and miscut direction (step edge direction). A comparison between experimental results and idealized step models of different surface compositions has been made. It has been found that the structure on the polished surface was in accordance with some surface compositions (the model of single-atom steps: Al steps or O steps). PMID:27444267

  17. Surface-Energy-Anisotropy-Induced Orientation Effects on RayleighInstabilities in Sapphire

    SciTech Connect

    Santala, Melissa; Glaeser, Andreas M.

    2006-01-01

    Arrays of controlled-geometry, semi-infinite pore channels of systematically varied crystallographic orientation were introduced into undoped m-plane (10{bar 1}0) sapphire substrates using microfabrication techniques and ion-beam etching and subsequently internalized by solid-state diffusion bonding. A series of anneals at 1700 C caused the breakup of these channels into discrete pores via Rayleigh instabilities. In all cases, channels broke up with a characteristic wavelength larger than that expected for a material with isotropic surface energy, reflecting stabilization effects due to surface-energy anisotropy. The breakup wavelength and the time required for complete breakup varied significantly with channel orientation. For most orientations, the instability wavelength for channels of radius R was in the range of 13.2R-25R, and complete breakup occurred within 2-10 h. To first order, the anneal times for complete breakup scale with the square of the breakup wavelength. Channels oriented along a <11{bar 2}0> direction had a wavelength of {approx} 139R, and required 468 h for complete breakup. Cross-sectional analysis of channels oriented along a <11{bar 2}0> direction showed the channel to be completely bounded by stable c(0001), r{l_brace}{bar 1}012{r_brace}, and s{l_brace}10{bar 1}1{r_brace} facets.

  18. Modeling and optimization of pulsed green laser dicing of sapphire using response surface methodology

    NASA Astrophysics Data System (ADS)

    Xie, Xiaozhu; Huang, Fumin; Wei, Xin; Hu, Wei; Ren, Qinglei; Yuan, Xuerui

    2013-02-01

    Laser dicing of single-crystalline sapphire substrate (α-Al2O3) with a pulsed Nd:YAG green (λ=532 nm) is investigated. The Box-Behnken Design (BBD) technique based response surface methodology (RSM) is employed to plan the experiment, then empirical models are developed to determine the correlation between responses and input variables, and finally multi-response optimization and quality testing are performed to obtain the optimum operating conditions. In the design of experiment (DOE), processing parameters, such as the pulse laser energy, scanning velocity and scanning times, are considered as the input independent variables, and the groove depth and width as the targeted responses. Results identify the most predominant parameters on the responses, provide insight into the interactions of these parameters, and obtain the optimized operating conditions. The specific combination-pulse laser energy of 150 μJ, scanning velocity of 0.55 mm/s, scanning times of three, can obtain a deep groove depth of 148 μm, narrow groove width of 19 μm with good dicing quality.

  19. Deep-UV sensors based on SAW oscillators using low-temperature-grown AlN films on sapphires.

    PubMed

    Laksana, Chipta; Chen, Meei-Ru; Liang, Yen; Tzou, An-Jyeg; Kao, Hui-Ling; Jeng, Erik; Chen, Jyh; Chen, Hou-Guang; Jian, Sheng-Rui

    2011-08-01

    High-quality epitaxial AlN films were deposited on sapphire substrates at low growth temperature using a helicon sputtering system. SAW filters fabricated on the AlN films exhibited excellent characteristics, with center frequency of 354.2 MHz, which corresponds to a phase velocity of 5667 m/s. An oscillator fabricated using AlN-based SAW devices is presented and applied to deep-UV light detection. A frequency downshift of about 43 KHz was observed when the surface of SAW device was illuminated by a UV source with dominant wavelength of around 200 nm. The results indicate the feasibility of developing remote sensors for deep-UV measurement using AlN-based SAW oscillators. PMID:21859589

  20. Deep-UV sensors based on SAW oscillators using low-temperature-grown AlN films on sapphires.

    PubMed

    Laksana, Chipta; Chen, Meei-Ru; Liang, Yen; Tzou, An-Jyeg; Kao, Hui-Ling; Jeng, Erik; Chen, Jyh; Chen, Hou-Guang; Jian, Sheng-Rui

    2011-08-01

    High-quality epitaxial AlN films were deposited on sapphire substrates at low growth temperature using a helicon sputtering system. SAW filters fabricated on the AlN films exhibited excellent characteristics, with center frequency of 354.2 MHz, which corresponds to a phase velocity of 5667 m/s. An oscillator fabricated using AlN-based SAW devices is presented and applied to deep-UV light detection. A frequency downshift of about 43 KHz was observed when the surface of SAW device was illuminated by a UV source with dominant wavelength of around 200 nm. The results indicate the feasibility of developing remote sensors for deep-UV measurement using AlN-based SAW oscillators.

  1. Structure and residual stress in γ-LiAlO 2 layer fabricated by vapor transport equilibration on (0 0 0 1) sapphire

    NASA Astrophysics Data System (ADS)

    Li, Shuzhi; Yang, Weiqiao; Wang, Yinzhen; Liu, Junfang; Zhou, Shengming; Xu, Jun; Han, Ping; zhang, Rong

    2005-08-01

    γ-LiAlO 2 layers with a highly preferred (1 0 0) orientation were prepared by vapor transport equilibration (VTE) technique on (0 0 0 1) sapphire substrate. Microstructure of the γ-LiAlO 2 layers was studied by XRD and SEM. In the temperature range from 750 to 1100 °C, the residual stress in the γ-LiAlO 2 layers varied from tensile to compressive with the increase of VTE temperature, and the critical point of the change between tensile and compressive stress is around 975 °C.

  2. Sharp semiconductor-to-metal transition of VO{sub 2} thin films on glass substrates

    SciTech Connect

    Jian, Jie; Chen, Aiping; Zhang, Wenrui; Wang, Haiyan

    2013-12-28

    Outstanding phase transition properties of vanadium dioxide (VO{sub 2}) thin films on amorphous glass were achieved and compared with the ones grown on c-cut sapphire and Si (111) substrates, all by pulsed laser deposition. The films on glass substrate exhibit a sharp semiconductor-to-metal transition (∼4.3 °C) at a near bulk transition temperature of ∼68.4 °C with an electrical resistance change as high as 3.2 × 10{sup 3} times. The excellent phase transition properties of the films on glass substrate are correlated with the large grain size and low defects density achieved. The phase transition properties of VO{sub 2} films on c-cut sapphire and Si (111) substrates were found to be limited by the high defect density.

  3. Numerical computation of sapphire crystal growth using heat exchanger method

    NASA Astrophysics Data System (ADS)

    Lu, Chung-Wei; Chen, Jyh-Chen

    2001-05-01

    The finite element software FIDAP is employed to study the temperature and velocity distribution and the interface shape during a large sapphire crystal growth process using a heat exchanger method (HEM). In the present study, the energy input to the crucible by the radiation and convection inside the furnace and the energy output through the heat exchanger is modeled by the convection boundary conditions. The effects of the various growth parameters are studied. It is found that the contact angle is obtuse before the solid-melt interface touches the sidewall of the crucible. Therefore, hot spots always appear in this process. The maximum convexity decreases significantly when the cooling-zone radius (RC) increases. The maximum convexity also decreases significantly as the combined convection coefficient inside the furnace (hI) decreases.

  4. Final EDP Ti: sapphire amplifiers for ELI project

    NASA Astrophysics Data System (ADS)

    Chvykov, Vladimir; Kalashnikov, Mikhail; Osvay, Károly

    2015-05-01

    Recently several ultrahigh intensity Chirped Pulse Amplification (CPA) laser systems have reached petawatt output powers [1, 2] setting the next milestone at tens or even hundreds petawatts for the next three to ten years [3, 4]. These remarkable results were reached when laser amplifiers (opposite to Optical Parametric Amplification (OPA) [5]) were used as final ones and from them Ti:Sapphire crystals supposed to be the working horses as well in the future design of these laser systems. Nevertheless, the main limitation that arises on the path toward ultrahigh output power and intensity is the restriction on the pumping and extraction energy imposed by Transverse Amplified Spontaneous Emission (TASE) [6] and/or transverse parasitic generation (TPG) [7] within the large aperture of the disc-shape amplifier volume.

  5. Laser surface and subsurface modification of sapphire using femtosecond pulses

    NASA Astrophysics Data System (ADS)

    Eberle, G.; Schmidt, M.; Pude, F.; Wegener, K.

    2016-08-01

    Two methods to process sapphire using femtosecond laser pulses are demonstrated, namely ablation (surface), and in-volume laser modification followed by wet etching (subsurface). Firstly, the single and multipulse ablation threshold is determined and compared with previous literature results. A unique application of ablation is demonstrated by modifying the entrance aperture of water jet orifices. Laser ablation exhibits advantages in terms of geometric flexibility and resolution, however, defects in the form of edge outbreaks and poor surface quality are evident. Secondly, the role of material transformation, polarisation state and formation of multi-focus structures after in-volume laser modification is investigated in order to explain their influence during the wet etching process. Laser scanning and electron microscopy as well as electron backscatter diffraction measurements supported by ion beam polishing are used to better understand quality and laser-material interactions of the two demonstrated methods of processing.

  6. Compressive failure in sapphire under CO2 laser heating

    NASA Astrophysics Data System (ADS)

    Miles, P. A.; Gallagher, J.; Gentilman, R. L.

    1980-07-01

    Irreversible changes were observed in sapphire crystals subjected to surface heating by CO2 laser irradiation at levels above 300 watts/square centimeter. The changes are interpreted as due to plastic flow under compressive stress at temperatures above 900 C. The recognition of possible compressive failures in refractory oxides is of importance in defining laser tolerance levels in high power optics, in the design of laser heating experiments to assess the thermal shock resistance of materials, and possibly in the field of laser assisted machining of ceramics. A detailed thermomechanical analysis was carried out to predict the temperature and stress conditions throughout disk samples as a function of time, heat flux level and flux distribution. Compressive stresses in excess of 200,000 psi were generated. Compressive failure is likely to precede tensile fracture in most experiments where partially heated disks are used.

  7. Temperature Compensated Sapphire Resonator for Ultra-Stable Oscillator Capability at Temperatures Above 77 Kelvin

    NASA Technical Reports Server (NTRS)

    Dick, G.; Santiago, D.; Wang, R.

    1994-01-01

    We report on the design and test of a whispering gallery sapphire resonator for which the dominant (WGH xxxsubn11) microwave mode family shows frequency-stable, compensated operation for temperatures above 77 Kelvin. The resonator makes possible a new ultra-stable oscillator (USO) capability that promises performance improvements over the best available crystal quartz oscillators in a compact cryogenic package. A mechanical compensation mechanism, enabled by the difference between copper and sapphire expansion coefficients, tunes the resonator to cancel the temperature variation of sapphire's dielectric constant.

  8. Thermal characteristics of sapphire contact probe delivery systems for laser angioplasty.

    PubMed

    Ashley, S; Brooks, S G; Gehani, A A; Kester, R C; Rees, M R

    1990-01-01

    Contact probes made from synthetic sapphire crystal, designed for general laser surgery, are currently being evaluated for use in laser angioplasty. Their mode of action and safety in the context of arterial recanalisation is unknown, particularly with respect to the degree of probe and catheter heating. Infrared thermal imaging was used to investigate the surface temperature rise of various rounded sapphire probes during emission of continuous wave Nd-YAG (1,064 nm) laser energy. Catheter safety was addressed by analyzing the temperature of the metal interface between the optical fiber and sapphire, as well as the catheter proximal to this junction. Transmission of Nd-YAG energy through each probe was also measured. Five rounded probes of 1.8-3.0 mm diameter (three supplied by Surgical Laser Technologies [SLT], two by Living Technology [LT]), along with their respective optical catheters, were compared. There was a large temperature gradient between the front and rim of the probes. The maximum surface temperature rise of the sapphire (at 20 W, 5-second exposure) was 314-339 degrees C (SLT) and 90-108 degrees C (LT) [P less than 0.001, 3-way ANOVA]. The reason for this difference may be related to "crazing" of the front surface of the SLT sapphires. At all energy levels sapphire temperatures were considerably lower than attained by metal laser thermal angioplasty probes. Forward transmission was slightly higher in the SLT probes (75-85%) than the LT sapphires (54-69%). With fiber perfusion at 2 ml/minute, a minor degree of heating of the metal sapphire holders was recorded (maximum rise 35 degrees C), but heating of the catheter proximal to this was negligible. Therefore, it would appear that the risk of tip detachment or arterial injury due to heating of the connecting metal interface is extremely low. Without perfusion, however, there was a greater degree of interface heating in the LT delivery system suggestive of more laser backscattering by these sapphires

  9. Thermal characteristics of sapphire contact probe delivery systems for laser angioplasty.

    PubMed

    Ashley, S; Brooks, S G; Gehani, A A; Kester, R C; Rees, M R

    1990-01-01

    Contact probes made from synthetic sapphire crystal, designed for general laser surgery, are currently being evaluated for use in laser angioplasty. Their mode of action and safety in the context of arterial recanalisation is unknown, particularly with respect to the degree of probe and catheter heating. Infrared thermal imaging was used to investigate the surface temperature rise of various rounded sapphire probes during emission of continuous wave Nd-YAG (1,064 nm) laser energy. Catheter safety was addressed by analyzing the temperature of the metal interface between the optical fiber and sapphire, as well as the catheter proximal to this junction. Transmission of Nd-YAG energy through each probe was also measured. Five rounded probes of 1.8-3.0 mm diameter (three supplied by Surgical Laser Technologies [SLT], two by Living Technology [LT]), along with their respective optical catheters, were compared. There was a large temperature gradient between the front and rim of the probes. The maximum surface temperature rise of the sapphire (at 20 W, 5-second exposure) was 314-339 degrees C (SLT) and 90-108 degrees C (LT) [P less than 0.001, 3-way ANOVA]. The reason for this difference may be related to "crazing" of the front surface of the SLT sapphires. At all energy levels sapphire temperatures were considerably lower than attained by metal laser thermal angioplasty probes. Forward transmission was slightly higher in the SLT probes (75-85%) than the LT sapphires (54-69%). With fiber perfusion at 2 ml/minute, a minor degree of heating of the metal sapphire holders was recorded (maximum rise 35 degrees C), but heating of the catheter proximal to this was negligible. Therefore, it would appear that the risk of tip detachment or arterial injury due to heating of the connecting metal interface is extremely low. Without perfusion, however, there was a greater degree of interface heating in the LT delivery system suggestive of more laser backscattering by these sapphires

  10. Experimental analysis of sapphire contact probes for Nd-YAG laser angioplasty.

    PubMed

    Ashley, S; Brooks, S G; Gehani, A A; Kester, R C; Rees, M R

    1990-06-01

    Laser angioplasty may offer percutaneous recanalization of occluded vessels where conventional guidewire and balloon techniques fail. Metal laser thermal angioplasty probes may, however, cause excessive thermal damage due to high tip temperatures (greater than 400.C). Therefore, contact probes made from artificial sapphire crystal designed for general laser surgery are currently being evaluated for use in laser angioplasty with continuous wave Nd-YAG energy. The sapphire modifies the laser energy in various ways, and this paper examines the physical characteristics of five types of rounded sapphire probe (SMTR, MTR, MTRL, OS, LT) and how these properties are affected by clinical usage. The laser beam profile emitted by these probes demonstrates a focal spot 1-2 mm in front of the tip. However, the forward transmission of Nd-YAG energy through the sapphires varied (SMTR, 85%; MTR, 83%; MTRL, 75%; OS, 54%; LT, 69%). Probe heating occurs owing to energy absorption within the sapphire. The surface temperature of the sapphires was measured in air by infrared thermography and the hottest region within the probes localized by an isothermographic technique. At energy settings used clinically (20 J, 10 watts for 2 s) the SMTR, MTR, and MTRL probes exhibited higher temperature rises (94-112.C) than the OS and LT probes (30.C), and heating was localized to the front surface of the former probes. Peak sapphire temperatures remained lower than those of metal probes even at higher energies. After clinical use, the MTR probe demonstrated reduced transmission, beam defocusing, and increased heating, due to surface pitting. Thus, recanalization with sapphire probes occurs by a combination of photothermal and contact thermal effects that are localized to the probe tip and may reduce the degree of thermal injury associated with metal probes. Understanding these basic properties is important to the application and development of contact probes for laser recanalization. PMID:2142867

  11. Aleutian disease of mink: the antibody response of sapphire and pastel mink to Aleutian disease virus.

    PubMed

    Bloom, M E; Race, R E; Hadlow, W J; Chesebro, B

    1975-10-01

    The specific antiviral antibody response of sapphire and pastel mink to Pullman strain of ADV has been examined. Sapphire mink inoculated with from 300,000-3 LD50 developed high levels of specific antibody and AD. Pastel mink inoculated with parallel doses of ADV also produced antibody but did not develop AD. The low incidence of AD in pastel mink inoculated with Pullman strain of ADV is probably related to factors other than antiviral antibody.

  12. Experimental analysis of sapphire contact probes for Nd-YAG laser angioplasty.

    PubMed

    Ashley, S; Brooks, S G; Gehani, A A; Kester, R C; Rees, M R

    1990-06-01

    Laser angioplasty may offer percutaneous recanalization of occluded vessels where conventional guidewire and balloon techniques fail. Metal laser thermal angioplasty probes may, however, cause excessive thermal damage due to high tip temperatures (greater than 400.C). Therefore, contact probes made from artificial sapphire crystal designed for general laser surgery are currently being evaluated for use in laser angioplasty with continuous wave Nd-YAG energy. The sapphire modifies the laser energy in various ways, and this paper examines the physical characteristics of five types of rounded sapphire probe (SMTR, MTR, MTRL, OS, LT) and how these properties are affected by clinical usage. The laser beam profile emitted by these probes demonstrates a focal spot 1-2 mm in front of the tip. However, the forward transmission of Nd-YAG energy through the sapphires varied (SMTR, 85%; MTR, 83%; MTRL, 75%; OS, 54%; LT, 69%). Probe heating occurs owing to energy absorption within the sapphire. The surface temperature of the sapphires was measured in air by infrared thermography and the hottest region within the probes localized by an isothermographic technique. At energy settings used clinically (20 J, 10 watts for 2 s) the SMTR, MTR, and MTRL probes exhibited higher temperature rises (94-112.C) than the OS and LT probes (30.C), and heating was localized to the front surface of the former probes. Peak sapphire temperatures remained lower than those of metal probes even at higher energies. After clinical use, the MTR probe demonstrated reduced transmission, beam defocusing, and increased heating, due to surface pitting. Thus, recanalization with sapphire probes occurs by a combination of photothermal and contact thermal effects that are localized to the probe tip and may reduce the degree of thermal injury associated with metal probes. Understanding these basic properties is important to the application and development of contact probes for laser recanalization.

  13. Jones calculus modeling and analysis of the thermal distortion in a Ti:sapphire laser amplifier.

    PubMed

    Cho, Seryeyohan; Jeong, Jihoon; Yu, Tae Jun

    2016-06-27

    The mathematical modeling of an anisotropic Ti:sapphire crystal with a significant thermal load is performed. The model is expressed by the differential Jones matrix. A thermally induced distortion in the chirped-pulse amplification process is shown by the solution of the differential Jones matrix. Using this model, the thermally distorted spatio-temporal laser beam shape is calculated for a high-power and high-repetition-rate Ti:sapphire amplifier. PMID:27410590

  14. Enhancement of performance of AlGaN/GaN high-electron-mobility transistors by transfer from sapphire to a copper plate

    NASA Astrophysics Data System (ADS)

    Hiroki, Masanobu; Kumakura, Kazuhide; Yamamoto, Hideki

    2016-05-01

    We transferred AlGaN/GaN high-electron-mobility transistors (HEMTs) from a sapphire substrate to a copper plate using the hexagonal boron nitride epitaxial lift-off technique. After transfer, the negative slope in the drain current I d decreased owing to the suppression of the self-heating effect. The significant increase in I d and the negative shift of threshold voltage indicate an increase in two-dimensional electron gas (2DEG) density. The increase in 2DEG density is at least partially caused by the reduction in compressive stress in the GaN layer after the transfer, which is revealed from the E 2 peak shifts of -1.3 cm-1 in Raman spectroscopy measurements. We also estimated the temperature in the active region of HEMTs by micro-Raman spectroscopy. For the transferred HEMT, the temperature at the gate edge on the drain side was 100 °C at a power dissipation of 0.9 W. In contrast, the temperature reached 240 °C at a power dissipation of only 0.7 W for the HEMT on the sapphire substrate. This indicates that the transfer technique can enhance the performance of AlGaN/GaN HEMTs.

  15. Wafer-scale highly-transparent and superhydrophilic sapphires for high-performance optics.

    PubMed

    Leem, Jung Woo; Yu, Jae Su

    2012-11-19

    We reported the wafer-scale highly-transparent and superhydrophilic sapphires with antireflective subwavelength structures (SWSs) which were fabricated by dry etching using thermally dewetted gold (Au) nanomasks. Their optical transmittance properties were experimentally and theoretically investigated. The density, size, and period of the thermally dewetted Au nanopatterns can be controlled by the Au film thickness. For the sapphire with both-side SWSs at 5 nm of Au film, the average total transmittance (T(avg)) of ~96.5% at 350-800 nm was obtained, indicating a higher value than those of the flat sapphire (T(avg)~85.6%) and the sapphire with one-side SWSs (T(avg)~91%), and the less angle-dependent transmittance property was observed. The calculated transmittance results also showed a similar tendency to the measured data. The SWSs enhanced significantly the surface hydrophilicity of sapphires, exhibiting a water contact angle (θ(c)) of < 5° for Au film of 5 nm compared to θ(c)~37° of the flat sapphire. PMID:23187471

  16. Cellular and humoral antibody responses of normal pastel and sapphire mink to goat erythrocytes.

    PubMed

    Lodmell, D L; Bergman, R K; Hadlow, W J; Munoz, J J

    1971-02-01

    This study was undertaken to determine whether normal sapphire and royal pastel mink differ immunologically at the cellular and humoral levels. Two days after primary intraperitoneal (ip) inoculation of goat erythrocytes (GE), essentially no 19 or 7S plaque-forming cells (PFC) per 10(6) cells were detected in spleen or in abdominal and peripheral lymph nodes of either color phase. On the 4th day, more 19S PFC were detected in pastel than in sapphire tissues; pastel tissues also contained 7S PFC, whereas essentially none was present in sapphires until the 6th day. After an ip booster inoculation, the number of PFC was markedly different between the two color phases. These differences were most apparent in spleen and peripheral lymph nodes. In parallel with differences observed in PFC responses between the color phases, total hemolysin and 2-mercaptoethanol-resistant hemolysin titers of pastels exceeded those of sapphires in all but one interval after the primary, and at every interval after the booster, inoculation. These data indicate that sapphire mink are not immunological cripples, nor are they immunologically hyperactive, but that differences do exist between sapphire and royal pastel mink, especially in the response to booster injections of GE. PMID:16557957

  17. Feasibility for non-destructive discrimination of natural and beryllium-diffused sapphires using Raman spectroscopy.

    PubMed

    Chang, Kyeol; Lee, Sanguk; Park, Jimin; Chung, Hoeil

    2016-03-01

    Raman spectroscopy based non-destructive discrimination between natural and beryllium-diffused (Be-diffused) sapphires has been attempted. The initial examination of Raman image acquired on a sapphire revealed that microscopic structural and compositional heterogeneity was apparent in the sample, so acquisition of spectra able to represent a whole body of sapphire rather than a localized area was necessary for a reliable discrimination. For this purpose, a wide area illumination (WAI) scheme (illumination area: 28.3mm(2)) providing a large sampling volume was employed to collect representative Raman spectra of sapphires. Upon the diffusion of Be into a sapphire, the band shift originated from varied lattice structure by substitution of Be at cation sites was observed and utilized as a valuable spectral signature for the discrimination. In the domain of principal component (PC) scores, the groups of natural and Be-diffused sapphires were identifiable with minor overlapping and the cross-validated discrimination error was 7.3% when k-Nearest Neighbor (k-NN) was used as a classifier. PMID:26717849

  18. Cellular and humoral antibody responses of normal pastel and sapphire mink to goat erythrocytes.

    PubMed

    Lodmell, D L; Bergman, R K; Hadlow, W J; Munoz, J J

    1971-02-01

    This study was undertaken to determine whether normal sapphire and royal pastel mink differ immunologically at the cellular and humoral levels. Two days after primary intraperitoneal (ip) inoculation of goat erythrocytes (GE), essentially no 19 or 7S plaque-forming cells (PFC) per 10(6) cells were detected in spleen or in abdominal and peripheral lymph nodes of either color phase. On the 4th day, more 19S PFC were detected in pastel than in sapphire tissues; pastel tissues also contained 7S PFC, whereas essentially none was present in sapphires until the 6th day. After an ip booster inoculation, the number of PFC was markedly different between the two color phases. These differences were most apparent in spleen and peripheral lymph nodes. In parallel with differences observed in PFC responses between the color phases, total hemolysin and 2-mercaptoethanol-resistant hemolysin titers of pastels exceeded those of sapphires in all but one interval after the primary, and at every interval after the booster, inoculation. These data indicate that sapphire mink are not immunological cripples, nor are they immunologically hyperactive, but that differences do exist between sapphire and royal pastel mink, especially in the response to booster injections of GE.

  19. Wafer-scale highly-transparent and superhydrophilic sapphires for high-performance optics.

    PubMed

    Leem, Jung Woo; Yu, Jae Su

    2012-11-19

    We reported the wafer-scale highly-transparent and superhydrophilic sapphires with antireflective subwavelength structures (SWSs) which were fabricated by dry etching using thermally dewetted gold (Au) nanomasks. Their optical transmittance properties were experimentally and theoretically investigated. The density, size, and period of the thermally dewetted Au nanopatterns can be controlled by the Au film thickness. For the sapphire with both-side SWSs at 5 nm of Au film, the average total transmittance (T(avg)) of ~96.5% at 350-800 nm was obtained, indicating a higher value than those of the flat sapphire (T(avg)~85.6%) and the sapphire with one-side SWSs (T(avg)~91%), and the less angle-dependent transmittance property was observed. The calculated transmittance results also showed a similar tendency to the measured data. The SWSs enhanced significantly the surface hydrophilicity of sapphires, exhibiting a water contact angle (θ(c)) of < 5° for Au film of 5 nm compared to θ(c)~37° of the flat sapphire.

  20. Feasibility for non-destructive discrimination of natural and beryllium-diffused sapphires using Raman spectroscopy.

    PubMed

    Chang, Kyeol; Lee, Sanguk; Park, Jimin; Chung, Hoeil

    2016-03-01

    Raman spectroscopy based non-destructive discrimination between natural and beryllium-diffused (Be-diffused) sapphires has been attempted. The initial examination of Raman image acquired on a sapphire revealed that microscopic structural and compositional heterogeneity was apparent in the sample, so acquisition of spectra able to represent a whole body of sapphire rather than a localized area was necessary for a reliable discrimination. For this purpose, a wide area illumination (WAI) scheme (illumination area: 28.3mm(2)) providing a large sampling volume was employed to collect representative Raman spectra of sapphires. Upon the diffusion of Be into a sapphire, the band shift originated from varied lattice structure by substitution of Be at cation sites was observed and utilized as a valuable spectral signature for the discrimination. In the domain of principal component (PC) scores, the groups of natural and Be-diffused sapphires were identifiable with minor overlapping and the cross-validated discrimination error was 7.3% when k-Nearest Neighbor (k-NN) was used as a classifier.

  1. Cellular and Humoral Antibody Responses of Normal Pastel and Sapphire Mink to Goat Erythrocytes

    PubMed Central

    Lodmell, D. L.; Bergman, R. K.; Hadlow, W. J.; Munoz, J. J.

    1971-01-01

    This study was undertaken to determine whether normal sapphire and royal pastel mink differ immunologically at the cellular and humoral levels. Two days after primary intraperitoneal (ip) inoculation of goat erythrocytes (GE), essentially no 19 or 7S plaque-forming cells (PFC) per 106 cells were detected in spleen or in abdominal and peripheral lymph nodes of either color phase. On the 4th day, more 19S PFC were detected in pastel than in sapphire tissues; pastel tissues also contained 7S PFC, whereas essentially none was present in sapphires until the 6th day. After an ip booster inoculation, the number of PFC was markedly different between the two color phases. These differences were most apparent in spleen and peripheral lymph nodes. In parallel with differences observed in PFC responses between the color phases, total hemolysin and 2-mercaptoethanol-resistant hemolysin titers of pastels exceeded those of sapphires in all but one interval after the primary, and at every interval after the booster, inoculation. These data indicate that sapphire mink are not immunological cripples, nor are they immunologically hyperactive, but that differences do exist between sapphire and royal pastel mink, especially in the response to booster injections of GE. PMID:16557957

  2. CW STED nanoscopy with a Ti:Sapphire oscillator

    NASA Astrophysics Data System (ADS)

    Liu, Yujia; Xie, Hao; Alonas, Eric; Santangelo, Philip J.; Jin, Dayong; Xi, Peng

    2012-12-01

    Fluorescence microscopy has become an essential tool to study biological molecules, pathways and events in living cells, tissues and animals. Meanwhile, the conventional optical microscopy is limited by the wavelength of the light. Even the most advanced confocal microscopy or multiphoton microscopy can only yield optical resolution approaching the diffraction limit of ~200 nm. This is still larger than many subcellular structures, which are too small to be resolved in detail. These limitations have driven the development of super-resolution optical imaging methodologies over the past decade. The stimulated emission depletion (STED) microscopy was the first and most direct approach to overcoming the diffraction limit for far-field nanoscopy. Typically, the excitation focus is overlapped by an intense doughnut-shaped spot to instantly de-excite markers from their fluorescent state to the ground state by stimulated emission. This effectively eliminates the periphery of the Point Spread Function (PSF), resulting in a narrower focal region, or super-resolution. Scanning a sharpened spot through the specimen renders images with sub-diffraction resolution. Multi-color STED imaging can present important structural and functional information for protein-protein interaction. In this work, we presented a dual color, synchronization-free STED stimulated emission depletion (STED) microscopy with a Ti:Sapphire oscillator. The excitation wavelengths were 532nm and 635nm, respectively. With pump power of 4.6 W and sample irradiance of 310 mW, we achieved super-resolution as high as 71 nm. We also imaged 200 nm nanospheres as well as all three cytoskeletal elements (microtubules, intermediate filaments, and actin filaments), clearly demonstrating the super-resolution resolving power over conventional diffraction limited imaging. It also allowed us to discover that, Dylight 650, exhibits improved performance over ATTO647N, a fluorophore frequently used in STED. Furthermore, we

  3. Vertical GaN based Light Emitting Diodes on Metal Alloy Substrate for Solid State Lighting Application

    NASA Astrophysics Data System (ADS)

    Doan, T.; Chu, C.; Chen, C.; Liu, W.; Chu, J.; Yeh, J.; Chen, H.; Fan, F.; Tran, C.

    2006-02-01

    Vertical GaN based Light Emitting Diodes on metal alloy substrate were realized and characterized for solid state lighting application. An efficiency of more than 70 lumens/watt was achieved. In addition, these LEDs exhibit many advantages over those on sapphire under extreme operation conditions for general lighting application.

  4. Temporal and energetic characteristics of ultrabroadband Ti3+:sapphire laser

    NASA Astrophysics Data System (ADS)

    Ter-Mikirtychev, Valery V.; Arestova, Ekaterina L.

    1999-04-01

    The main temporal and energetic characteristics of an ultra- broadband nanosecond Ti3+:sapphire laser are measured. The laser resonator employs a prism pair and a diaphragm creating a `spatially dispersive' cavity, and then is allowed to maintain the lasing conditions simultaneously for different spectral components in different areas of the active element. Second-harmonic radiation from a Q-switched YAG:Nd3+ laser with a 632-nm oscillating wavelength and up to 210 mJ of pulse energy was utilized as a pumping source. The ultrabroadband laser was transversely pumped and operated simultaneously in 685- to 955-nm region with a minimum pulse duration of 25 ns, pulse energy of up to 17.8 mJ, a pulse repetition rate of 10 Hz, and 8.5% real pumping to lasing efficiency. Oscillation build-up time was 19.8 ns at a 775-nm wavelength and was varied for different spectral components by only 7 ns in the 700- to 912-nm region.

  5. Density distribution in the liquid Hg-sapphire interface.

    PubMed

    Zhao, Meishan; Rice, Stuart A

    2011-04-28

    We present the results of a computer simulation study of the liquid density distribution normal to the interface between liquid Hg and the reconstructed (0001) face of sapphire. The simulations are based on an extension of the self-consistent quantum Monte Carlo scheme previously used to study the structure of the liquid metal-vapor interface. The calculated density distribution is in very good agreement with that inferred from the recent experimental data of Tamam et al. (J. Phys. Chem. Lett. 2010, 1, 1041-1045). We conclude that, to account for the difference in structure between the liquid Hg-vapor and liquid-Hg-reconstructed (0001) Al(2)O(3) interfaces, it is not necessary to assume there is charge transfer from the Hg to the Al(2)O(3). Rather, the available experimental data are adequately reproduced when the van der Waals interactions of the Al and O atoms with Hg atoms and the exclusion of electron density from Al(2)O(3) via repulsion of the electrons from the closed shells of the ions in the solid are accounted for.

  6. Harmonic Generation in Argon by Femtosecond Ti:Sapphire Laser

    NASA Astrophysics Data System (ADS)

    Qindeel, Rabia; Samad, Ricardo Elgul; de Freitas, Anderson Zanardi; de Matos, Paulo Sergio Fabris; Falcão, Edilson Lucena; Vieira Junior, Nilson Dias

    Generation of harmonics using a gas nozzle has remarkable feature in various applications. Pulses from a Ti:Sapphire laser, centered at 785 nm, in a 4 kHz train, with 25 femtoseconds and 800 μJ of maximum energy were employed to generate harmonics in an argon gas nozzle. We present the current results on the focusability of the nozzle, harmonic radiation, measurement of the influence of laser power and laser focus position on the divergence of gas nozzle. We have successfully generated 3rd, 5th and 7th harmonics in Argon at different laser powers. The results show that the harmonic signals are almost same for laser average powers over 1.0 W and variation always appears below 1.0 W. It means that there is saturation in the physical phenomenon happening inside the gas nozzle at high laser powers and the variation is non-linear below 1.0 W. These results are embedded in an effort towards x-ray generation in the water window.

  7. Optical properties of sapphire in its opacity range

    NASA Astrophysics Data System (ADS)

    Rogalin, V. E.; Kaplunov, I. A.; Tsenina, I. S.; Andreeva, M. S.; Filin, S. A.

    2016-06-01

    We have studied the reflection spectrum of leucosapphire in the range of 2.5-25.0 μm. Based on the analysis of the known frequency and temperature dependences of the absorption coefficient in the range of 2.5-7.0 μm, its extrapolation to the range of 10.6 μm has been performed. We have shown that the absorption coefficient in the range of 10.6 μm and in the temperature interval 300-2300 K can be evaluated as β = (2-3) × 104 cm-1. It has also been shown that the value of this characteristic correlates with the results of investigations of the action of a powerful radiation pulse of a CO2 laser on the surface of anodized aluminum. These data can be used in the development of technologies of laser processing of articles made of sapphire and ceramics based on aluminum oxide, as well as anodized articles made of aluminum alloys.

  8. Thermal and optical behavior of sapphire fiber tips for laser angioplasty

    NASA Astrophysics Data System (ADS)

    Ashley, Simon; Brooks, Stephen G.; Gehani, Abdurrazak A.; Kester, Ralph C.; Rees, Michael R.

    1990-07-01

    Atraumatic rounded contact probes made from artificial sapphire crystal were developed for general laser surgery and are currently being evaluated for use in percutaneous laser angioplasty utilising continuous wave (cw) Nd-YAG energy (1064nm). The thermal and optical characteristics of five different types of rounded sapphire probe [Surgical Laser Technologies (SLT) - SMTR (1.8mm), MTh (2.2mm), MTRL (3.0mm); Living Technology - LT (2.2mm), OS (2.2mm)] were investigated and related to efficiency of contact ablation of arterial wall in vitro. The sapphire probes were mounted on catheters containing a 0.6 mm quartz optical fiber, coupled to a cw Nd-YAG laser. All probes produced a similar beam profile but there was some variation in their forward transmission of energy (54-85%).Probe heating occurs due to energy absorption within the sapphire and was measured in air by infrared thermography. There was a high temperature gradient from the front surface of the sapphires to the probe rim. But, at energy settings used clinically (10 J pulses, 10 Watts for 1 second) the SMTR, MTR, and MTRL probes exhibited a higher mean temperature rise (63-74 C) than the OS and LT probes (20 C) [3-way ANOVA psapphire temperature rise recorded after 5 seconds exposure at 20 Watts was 340 C, but at all energy settings sapphire temperatures were much lower than attained by metal probes. Furthermore, there was relatively little heating of the metal jacket behind the sapphires (maximum 35 C) reducing the risk of thermal injury to surrounding vessel. These properties enhanced contact ablation by the MTR probe relative to the other 2.2mm probes when applied with a downward force of 80 g, perpendicular to fresh porcine aortic segments immersed in whole blood. Penetration efficiencies at energy levels producing the most efficient ablation by each probe were as follows [mean (SD) microns/JI:- MTR 50 (7), LT 9 (5), 05 4 (2), (p

  9. Accurate determination of optical bandgap and lattice parameters of Zn{sub 1-x}Mg{sub x}O epitaxial films (0{<=}x{<=}0.3) grown by plasma-assisted molecular beam epitaxy on a-plane sapphire

    SciTech Connect

    Laumer, Bernhard; Schuster, Fabian; Stutzmann, Martin; Bergmaier, Andreas; Dollinger, Guenther; Eickhoff, Martin

    2013-06-21

    Zn{sub 1-x}Mg{sub x}O epitaxial films with Mg concentrations 0{<=}x{<=}0.3 were grown by plasma-assisted molecular beam epitaxy on a-plane sapphire substrates. Precise determination of the Mg concentration x was performed by elastic recoil detection analysis. The bandgap energy was extracted from absorption measurements with high accuracy taking electron-hole interaction and exciton-phonon complexes into account. From these results a linear relationship between bandgap energy and Mg concentration is established for x{<=}0.3. Due to alloy disorder, the increase of the photoluminescence emission energy with Mg concentration is less pronounced. An analysis of the lattice parameters reveals that the epitaxial films grow biaxially strained on a-plane sapphire.

  10. GaN-based light-emitting diodes on various substrates: a critical review

    NASA Astrophysics Data System (ADS)

    Li, Guoqiang; Wang, Wenliang; Yang, Weijia; Lin, Yunhao; Wang, Haiyan; Lin, Zhiting; Zhou, Shizhong

    2016-05-01

    GaN and related III-nitrides have attracted considerable attention as promising materials for application in optoelectronic devices, in particular, light-emitting diodes (LEDs). At present, sapphire is still the most popular commercial substrate for epitaxial growth of GaN-based LEDs. However, due to its relatively large lattice mismatch with GaN and low thermal conductivity, sapphire is not the most ideal substrate for GaN-based LEDs. Therefore, in order to obtain high-performance and high-power LEDs with relatively low cost, unconventional substrates, which are of low lattice mismatch with GaN, high thermal conductivity and low cost, have been tried as substitutes for sapphire. As a matter of fact, it is not easy to obtain high-quality III-nitride films on those substrates for various reasons. However, by developing a variety of techniques, distincts progress has been made during the past decade, with high-performance LEDs being successfully achieved on these unconventional substrates. This review focuses on state-of-the-art high-performance GaN-based LED materials and devices on unconventional substrates. The issues involved in the growth of GaN-based LED structures on each type of unconventional substrate are outlined, and the fundamental physics behind these issues is detailed. The corresponding solutions for III-nitride growth, defect control, and chip processing for each type of unconventional substrate are discussed in depth, together with a brief introduction to some newly developed techniques in order to realize LED structures on unconventional substrates. This is very useful for understanding the progress in this field of physics. In this review, we also speculate on the prospects for LEDs on unconventional substrates.

  11. GaN-based light-emitting diodes on various substrates: a critical review.

    PubMed

    Li, Guoqiang; Wang, Wenliang; Yang, Weijia; Lin, Yunhao; Wang, Haiyan; Lin, Zhiting; Zhou, Shizhong

    2016-05-01

    GaN and related III-nitrides have attracted considerable attention as promising materials for application in optoelectronic devices, in particular, light-emitting diodes (LEDs). At present, sapphire is still the most popular commercial substrate for epitaxial growth of GaN-based LEDs. However, due to its relatively large lattice mismatch with GaN and low thermal conductivity, sapphire is not the most ideal substrate for GaN-based LEDs. Therefore, in order to obtain high-performance and high-power LEDs with relatively low cost, unconventional substrates, which are of low lattice mismatch with GaN, high thermal conductivity and low cost, have been tried as substitutes for sapphire. As a matter of fact, it is not easy to obtain high-quality III-nitride films on those substrates for various reasons. However, by developing a variety of techniques, distincts progress has been made during the past decade, with high-performance LEDs being successfully achieved on these unconventional substrates. This review focuses on state-of-the-art high-performance GaN-based LED materials and devices on unconventional substrates. The issues involved in the growth of GaN-based LED structures on each type of unconventional substrate are outlined, and the fundamental physics behind these issues is detailed. The corresponding solutions for III-nitride growth, defect control, and chip processing for each type of unconventional substrate are discussed in depth, together with a brief introduction to some newly developed techniques in order to realize LED structures on unconventional substrates. This is very useful for understanding the progress in this field of physics. In this review, we also speculate on the prospects for LEDs on unconventional substrates.

  12. Optimization of the structural quality of sapphire rods grown by the Stepanov method in a reducing atmosphere

    SciTech Connect

    Kryvonosov, Ye. V.; Konevskiy, P. V. Lytvynov, L. A.; Tkachenko, V. F.

    2015-03-15

    Historically, the Stepanov method has been used for growing long shaped sapphire crystals (rods, tubes, and ribbons) for practical design. The recent intense development of this technique was stimulated by sapphire applications in optics and electronics; thus, the optical and structural quality of these crystals is of great importance. The results of studying the structural quality of sapphire rods up to 18 mm in diameter grown under optimized conditions are reported.

  13. Highly c-axis oriented growth of GaN film on sapphire (0001) by laser molecular beam epitaxy using HVPE grown GaN bulk target

    SciTech Connect

    Kushvaha, S. S.; Kumar, M. Senthil; Maurya, K. K.; Dalai, M. K.; Sharma, Nita D.

    2013-09-15

    Growth temperature dependant surface morphology and crystalline properties of the epitaxial GaN layers grown on pre-nitridated sapphire (0001) substrates by laser molecular beam epitaxy (LMBE) were investigated in the range of 500–750 °C. The grown GaN films were characterized using high resolution x-ray diffraction, atomic force microscopy (AFM), micro-Raman spectroscopy, and secondary ion mass spectroscopy (SIMS). The x-ray rocking curve full width at a half maximum (FWHM) value for (0002) reflection dramatically decreased from 1582 arc sec to 153 arc sec when the growth temperature was increased from 500 °C to 600 °C and the value further decreased with increase of growth temperature up to 720 °C. A highly c-axis oriented GaN epitaxial film was obtained at 720 °C with a (0002) plane rocking curve FWHM value as low as 102 arc sec. From AFM studies, it is observed that the GaN grain size also increased with increasing growth temperature and flat, large lateral grains of size 200-300 nm was obtained for the film grown at 720 °C. The micro-Raman spectroscopy studies also exhibited the high-quality wurtzite nature of GaN film grown on sapphire at 720 °C. The SIMS measurements revealed a non-traceable amount of background oxygen impurity in the grown GaN films. The results show that the growth temperature strongly influences the surface morphology and crystalline quality of the epitaxial GaN films on sapphire grown by LMBE.

  14. All-glass optical fibers derived from sapphire

    NASA Astrophysics Data System (ADS)

    Dragic, Peter D.; Hawkins, Thomas; Foy, Paul; Morris, Stephanie; Ballato, John

    2013-02-01

    Increasing power levels and novel applications are demanding from fibers performance capabilities that have, to date, not been realized. One such example arises from the nascent push towards the 10-kW power threshold for narrow linewidth fiber lasers designed for applications including coherently-phased laser arrays and spectroscopic lidars. It is well-known that Brillouin scattering still restricts continued power scaling in these systems, despite several recent advances in acoustic-wave Brillouin management. Accordingly, novel fibers possessing a Brillouin gain coefficient 10 dB or more less than previously demonstrated would be of great practical benefit if they comprise novel materials in simple geometries and are manufactured using industry-accepted methods. Introducing a new and effective approach to the management of Brillouin scattering, we present on all-glass optical fibers derived from silica-clad sapphire with alumina concentrations up to 55 mole percent; considerably greater than conventionally possible enabling the design of optical fiber possessing a series of essential properties. Markedly, a Brillouin gain coefficient of 3.1 × 10-13 m/W was measured for a fiber with an average alumina concentration of 54 mole percent. This value is nearly 100 times lower than standard commercial single-mode fiber and is likely the lowest ever specified value. This reduction in Brillouin gain is enabled by a number of key material properties of the alumina-silica system, amazingly even leading to a predicted, but not yet demonstrated, composition with zero Brillouin gain. Optical fiber materials with these and other crucial properties will be discussed in the context high energy fiber laser systems.

  15. Chirped-Pulse Amplification with flashlamp-pumped Ti:Sapphire amplifiers. Revision 1

    SciTech Connect

    Bonlie, J.D.; White, W.E.; Price, D.F.; Reitze, D.H.

    1994-01-01

    Ti:Sapphire (Ti:Al{sub 2}O{sub 3}) amplifier stages are typically pumped with Q-switched Nd:YAG lasers doubled to 532 nm because of good spectral overlap, short temporal width, high repetition rate (i.e., 10 Hz to > 5 kHz) and the problems associated with flashlamp pumping a material with a relatively short upper state lifetime. Limitations to this pumping method arise due to the 1 to 1.5 joule/pulse ceiling found in most commercial high rep rate Nd:YAG lasers. The availability of high quality, large aperture Ti:Sapphire rods has made the flashlamp-pumping scheme an attractive option. The excellent thermal properties of Ti:Sapphire also allows an amplifier to be operated at high repetition rates. The front end of our laser relies on Chirped Pulse Amplification (CPA) in laser pumped Ti:Sapphire to generate 55 mJ, 90 fsec pulses at a 10 Hz rate. We report the use of a flashlamp pumped Ti:Sapphire head to further amplify the output of our system, producing 90 fsec, 250 mJ pulses at 5 Hz. The excellent output spatial profile yields a near diffraction-limited 5 {mu}m spot size and peak irradiance in excess of 5 {times} 10{sup 18} W/cm{sup 2}.

  16. Chirped-Pulse Amplification with flashlamp-pumped Ti:Sapphire amplifiers

    SciTech Connect

    Bonlie, J.D.; White, W.E.; Price, D.F.; Reitze, D.H.

    1994-01-01

    Ti:Sapphire (Ti:Al{sub 2}O{sub 3}) amplifier stages are typically pumped with Q-switched Nd:YAG lasers doubled to 532 nm because of good spectral overlap, short temporal width, high repetition rate (i.e., 10 Hz to > 5 kHz) and the problems associated with flashlamp pumping a material with a relatively short upper state lifetime. Limitations to this pumping method arise due to the 1 to 1.5 joule/pulse ceiling found in most commercial high rep rate Nd:YAG lasers. The availability of high quality, large aperture Ti:Sapphire rods has made the flashlamp-pumping scheme an attractive option. The excellent thermal properties of Ti:Sapphire also allows an amplifier to be operated at high repetition rates. The front end of our laser relies on Chirped Pulse Amplification (CPA) in laser pumped Ti:Sapphire to generate 55 NJ, 90 fsec pulses at a 10 Hz rate. We report the use of a flashlamp pumped Ti:Sapphire head to further amplify the output of our system, producing 90 fsec, 250 NJ pulses at 5 Hz. The excellent output spatial profile yields a near diffraction-limited 5 {mu}m spot size and peak irradiance in excess of 5 {times} 10{sup 18} W/cm{sup 2}.

  17. Temperature Compensated Sapphire Resonator for Ultrastable Oscillator Operating at Temperatures Near 77 Deg Kelvin

    NASA Technical Reports Server (NTRS)

    Dick, G. John (Inventor); Santiago, David G. (Inventor)

    1999-01-01

    A sapphire resonator for an ultrastable oscillator capable of substantial performance improvements over the best available crystal quartz oscillators in a compact cryogenic package is based on a compensation mechanism enabled by the difference between copper and sapphire thermal expansion coefficients for so tuning the resonator as to cancel the temperature variation of the sapphire's dielectric constant. The sapphire resonator consists of a sapphire ring separated into two parts with webs on the outer end of each to form two re-entrant parts which are separated by a copper post. The re-entrant parts are bonded to the post by indium solder for good thermal conductivity between parts of that subassembly which is supported on the base plate of a closed copper cylinder (rf shielding casing) by a thin stainless steel cylinder. A unit for temperature control is placed in the stainless steel cylinder and is connected to the subassembly of re-entrant parts and copper post by a layer of indium for good thermal conduction. In normal use, the rf shielding casing is placed in a vacuum tank which is in turn placed in a thermos flask of liquid nitrogen. The temperature regulator is controlled from outside the thermos flask to a temperature in a range of about 40K to 150K, such as 87K for the WGH-811, mode of resonance in response to microwave energy inserted into the rf shielding casing through a port from an outside source.

  18. Enhancing the Thermal Conductance of Polymer and Sapphire Interface via Self-Assembled Monolayer.

    PubMed

    Zheng, Kun; Sun, Fangyuan; Zhu, Jie; Ma, Yongmei; Li, Xiaobo; Tang, Dawei; Wang, Fosong; Wang, Xiaojia

    2016-08-23

    Interfacial thermal conductance (ITC) receives enormous consideration because of its significance in determining thermal performance of hybrid materials, such as polymer based nanocomposites. In this study, the ITC between sapphire and polystyrene (PS) was systematically investigated by time domain thermoreflectance (TDTR) method. Silane based self-assembled monolayers (SAMs) with varying end groups, -NH2, -Cl, -SH and -H, were introduced into sapphire/PS interface, and their effects on ITC were investigated. The ITC was found to be enhanced up by a factor of 7 through functionalizing the sapphire surface with SAM, which ends with a chloride group (-Cl). The results show that the enhancement of the thermal transport across the SAM-functionalized interface comes from both strong covalent bonding between sapphire and silane-based SAM, and the high compatibility between the SAM and PS. Among the SAMs studied in this work, we found that the ITC almost linearly depends on solubility parameters, which could be the dominant factor influencing on the ITC compared with wettability and adhesion. The SAMs serve as an intermediate layer that bridges the sapphire and PS. Such a feature can be applied to ceramic-polymer immiscible interfaces by functionalizing the ceramic surface with molecules that are miscible with the polymer materials. This research provides guidance on the design of critical-heat transfer materials such as composites and nanofluids for thermal management.

  19. Enhancing the Thermal Conductance of Polymer and Sapphire Interface via Self-Assembled Monolayer.

    PubMed

    Zheng, Kun; Sun, Fangyuan; Zhu, Jie; Ma, Yongmei; Li, Xiaobo; Tang, Dawei; Wang, Fosong; Wang, Xiaojia

    2016-08-23

    Interfacial thermal conductance (ITC) receives enormous consideration because of its significance in determining thermal performance of hybrid materials, such as polymer based nanocomposites. In this study, the ITC between sapphire and polystyrene (PS) was systematically investigated by time domain thermoreflectance (TDTR) method. Silane based self-assembled monolayers (SAMs) with varying end groups, -NH2, -Cl, -SH and -H, were introduced into sapphire/PS interface, and their effects on ITC were investigated. The ITC was found to be enhanced up by a factor of 7 through functionalizing the sapphire surface with SAM, which ends with a chloride group (-Cl). The results show that the enhancement of the thermal transport across the SAM-functionalized interface comes from both strong covalent bonding between sapphire and silane-based SAM, and the high compatibility between the SAM and PS. Among the SAMs studied in this work, we found that the ITC almost linearly depends on solubility parameters, which could be the dominant factor influencing on the ITC compared with wettability and adhesion. The SAMs serve as an intermediate layer that bridges the sapphire and PS. Such a feature can be applied to ceramic-polymer immiscible interfaces by functionalizing the ceramic surface with molecules that are miscible with the polymer materials. This research provides guidance on the design of critical-heat transfer materials such as composites and nanofluids for thermal management. PMID:27501117

  20. Properties Data for Adhesion and Surface Chemistry of Aluminum: Sapphire-Aluminum, Single-Crystal Couple

    NASA Technical Reports Server (NTRS)

    Miyoshi, Kazuhisa; Pohlchuck, Bobby; Whitle, Neville C.; Hector, Louis G., Jr.; Adams, Jim

    1998-01-01

    An investigation was conducted to examine the adhesion and surface chemistry of single-crystal aluminum in contact with single-crystal sapphire (alumina). Pull-off force (adhesion) measurements were conducted under loads of 0. I to I mN in a vacuum of 10(exp -1) to 10(exp -9) Pa (approx. 10(exp -10) to 10(exp -11) torr) at room temperature. An Auger electron spectroscopy analyzer incorporated directly into an adhesion-measuring vacuum system was primarily used to define the chemical nature of the surfaces before and after adhesion measurements. The surfaces were cleaned by argon ion sputtering. With a clean aluminum-clean -sapphire couple the mean value and standard deviation of pull-off forces required to separate the surfaces were 3015 and 298 micro-N, respectively. With a contaminated aluminum-clean sapphire couple these values were 231 and 241 micro-N. The presence of a contaminant film on the aluminum surface reduced adhesion by a factor of 13. Therefore, surfaces cleanliness, particularly aluminum cleanliness, played an important role in the adhesion of the aluminum-sapphire couples. Pressures on the order of 10(exp -8) to 10(exp -9) Pa (approx. 10(exp -10) to 10(exp -11) torr) maintained a clean aluminum surface for only a short time (less then 1 hr) but maintained a clean sapphire surface, once it was achieved, for a much longer time.

  1. Absorption and fluorescence of alexandrite and of titanium in sapphire and glass

    NASA Technical Reports Server (NTRS)

    Byvik, C. E.; Hess, R. V.; Buoncristiani, A. M.

    1985-01-01

    The fluorescence and absorption data for titanium in crystalline sapphire and titanium doped into two silicate and one phosphate glass structures are analyzed. It is observed that the Ti-doped silicate glass sample exhibits no absorption related to the Ti(III) ion, the Ti-doped phosphate glass is deep blue, the absorption line width of the glass samples are a factor of two larger than that of sapphire, and the absorption peak for the Ti in the glass shifted about 100 nm to the red from the Ti:sapphire absorption peak. This shift reveals that the Ti(III) ion is sensitive to the crystalline environment and not to the glass environment. The photoluminescence spectra for Ti-doped sapphire and alexandrite are compared. It is detected that the Ti:sapphire exhibits a broader spectrum than that for alexandrite with a peak at 750 nm. The three zero phonon transitions of Ti:Al2O3 at liquid nitrogen temperatures are studied.

  2. Piezoelectric field in highly stressed GaN-based LED on Si (1 1 1) substrate

    NASA Astrophysics Data System (ADS)

    Tawfik, Wael Z.; Hyun, Gil Yong; Ryu, Sang-Wan; Ha, June Seok; Lee, June Key

    2016-05-01

    Stress states in GaN epilayers grown on Si (1 1 1) and c-plane sapphire, and their effects on built-in piezoelectric field induced by compressive stress in InGaN/GaN multi-quantum well (MQW) light-emitting diodes (LEDs) were investigated using the electroreflectance (ER) spectroscopic technique. Relatively large tensile stress is observed in GaN epilayers grown on Si (1 1 1), while a small compressive stress appears in the film grown on c-plane sapphire. The InGaN/GaN MQWs of LED on c-plane sapphire substrate has a higher piezoelectric field than the MQWs of LEDs on Si (1 1 1) substrate by about 1.04 MV/cm. The large tensile stress due to lattice mismatch with Si (1 1 1) substrate is regarded as external stress. The external tensile stress from the Si substrate effectively compensates for the compressive stress developed in the active region of the InGaN/GaN MQWs, thus reducing the quantum-confined Stark effect (QCSE) by attenuating the piezoelectric polarization from the InGaN layer.

  3. Temperature-dependent photoluminescence spectra of GaN epitaxial layer grown on Si (111) substrate

    NASA Astrophysics Data System (ADS)

    Zhao, Dan-Mei; Zhao, De-Gang; Jiang, De-Sheng; Liu, Zong-Shun; Zhu, Jian-Jun; Chen, Ping; Liu, Wei; Li, Xiang; Shi, Ming

    2015-10-01

    In this paper, the temperature-dependent photoluminescence (PL) properties of GaN grown on Si (111) substrate are studied. The main emission peaks of GaN films grown on Si (111) are investigated and compared with those grown on sapphire substrates. The positions of free and bound exciton luminescence peaks, i.e., FXA and D0X peaks, of GaN films grown on Si (111) substrates undergo red shifts compared with those grown on sapphire. This is attributed to the fact that the GaN films grown on sapphire are under the action of compressive stress, while those grown on Si (111) substrate are subjected to tensile stress. Furthermore, the positions of these peaks may be additionally shifted due to different stress conditions in the real sample growth. The emission peaks due to stacking faults are found in GaN films grown on Si (111) and an S-shaped temperature dependence of PL spectra can be observed, owing to the influence of the quantum well (QW) emission by the localized states near the conduction band gap edge and the temperature-dependent distribution of the photo-generated carriers. Project supported by the National Natural Science Foundation of China (Grant Nos. 61474110, 61377020, 61376089, 61223005, and 61176126) and the National Science Fund for Distinguished Young Scholars of China (Grant No. 60925017).

  4. The effects of substrate surface structure on yttria-stabilized zirconia thin films

    NASA Astrophysics Data System (ADS)

    Jiang, Jun; Clark, Daniel; Shen, Weida; Hertz, Joshua L.

    2014-02-01

    Thin film properties can be controlled to a large degree by the substrate upon which the film is grown. The substrate surface can affect the film's crystal phase and microstructure and, thereby, many other properties. In this study, yttria-stabilized zirconia films on single crystal MgO and Al2O3 substrates with polished, ion cleaned, or milled surfaces were studied. The different substrate surfaces influenced the thin films' microstructures and ionic conductivities. The increased roughness of the milled surfaces led to significant decreases in both the crystallinity and the ionic conductivity of the films. Ion cleaning of the substrate surface immediately before deposition did not affect the conductivity of films on MgO substrates but led to conductivity reductions by a factor of about 4 on sapphire substrates.

  5. Interfacial shear strength of cast and directionally solidified NiAl-sapphire fiber composites

    NASA Astrophysics Data System (ADS)

    Tewari, S. N.; Asthana, R.; Noebe, R. D.

    1993-09-01

    The feasibility of fabricating intermetallic NiAl-sapphire fiber composites by casting and zone directional solidification has been examined. The fiber-matrix interfacial shear strengths measured using a fiber push-out technique in both cast and directionally solidified composites are greater than the strengths reported for composites fabricated by powder cloth process using organic binders. Microscopic examination of fibers extracted from cast, directionally solidified (DS), and thermally cycled composites, and the high values of interfacial shear strengths suggest that the fiber-matrix interface does not degrade due to casting and directional solidification. Sapphire fibers do not pin grain boundaries during directional solidification, suggesting that this technique can be used to fabricate sapphire fiber reinforced NiAl composites with single crystal matrices.

  6. High Temperature Testing with Sapphire Fiber White-Light Michelson Interferometers

    NASA Technical Reports Server (NTRS)

    Barnes, A.; Pedrazzani, J.; May, R.; Murphy, K.; Tran, T.; Coate, J.

    1996-01-01

    In the design of new aerospace materials, developmental testing is conducted to characterize the behavior of the material under severe environmental conditions of high stress, temperature, and vibration. But to test these materials under extreme conditions requires sensors that can perform in harsh environments. Current sensors can only monitor high temperature test samples using long throw instrumentation, but this is inherently less accurate than a surface mounted sensor, and provides no means for fabrication process monitoring. A promising alternative is the use of sapphire optical fiber sensors. Sapphire is an incredibly rugged material, being extremely hard (9 mhos), chemically inert, and having a melting temperature (over 2000 C). Additionally, there is a extensive background of optical fiber sensors upon which to draw for sapphire sensor configurations.

  7. Thermal-induced wavefront aberration in sapphire-cooled Nd:glass slab

    NASA Astrophysics Data System (ADS)

    Huang, Tingrui; Huang, Wenfa; Wang, Jiangfeng; Lu, Xinghua; Li, Xuechun

    2016-07-01

    We demonstrate for the first time a sapphire-cooled Nd:glass composite assembly based on optical bonding of two thin sapphire plates to a Nd:glass slab for efficient heat removal. The distributions of temperature, stress, depolarization loss, and wavefront aberration were obtained by finite element analysis. The simulation results were verified experimentally. Although the heat generation rate was 4.5 W/cm3, the temperature increase was within 5.7 °C at the center of the sapphire surface, and the whole wavefront aberration was 1.21 λ ( λ = 1053 nm). This demonstration opens up a viable path toward novel repetition rate Nd:glass laser amplifier designs with efficient double-sided room-temperature heat sinking on both sides of the slab.

  8. Interfacial Shear Strength of Cast and Directionally Solidified Nial-Sapphire Fiber Composites

    NASA Technical Reports Server (NTRS)

    Tewari, S. N.; Asthana, R.; Noebe, R. D.

    1993-01-01

    The feasibility of fabricating intermetallic NiAl-sapphire fiber composites by casting and zone directional solidification has been examined. The fiber-matrix interfacial shear strengths measured using a fiber push-out technique in both cast and directionally solidified composites are greater than the strengths reported for composites fabricated by powder cloth process using organic binders. Microscopic examination of fibers extracted from cast, directionally solidified (DS), and thermally cycled composites, and the high values of interfacial shear strengths suggest that the fiber-matrix interface does not degrade due to casting and directional solidification. Sapphire fibers do not pin grain boundaries during directional solidification, suggesting that this technique can be used to fabricate sapphire fiber reinforced NiAl composites with single crystal matrices.

  9. Rate of F center formation in sapphire under low-energy low-fluence Ar+ irradiation

    NASA Astrophysics Data System (ADS)

    Epie, E. N.; Wijesundera, D. N.; Tilakaratne, B. P.; Chen, Q. Y.; Chu, W. K.

    2016-03-01

    Ionoluminescence, optical absorption spectroscopy and Rutherford backscattering spectrometry channelling (RBS-C) have been used to study the rate of F center formation with fluence in 170 keV Ar+ irradiated single crystals of α-Al2O3 (sapphire) at room temperature. Implantation fluences range between 1013 cm-2 and 5 ×1014 cm-2. F center density (NF) has been found to display an initial rapid linear increase with Ar+ fluence followed by saturation to a maximum value of 1.74 ×1015 cm-2. Experimental results show a 1-1 correlation between radiation damage in the oxygen sublattice and F center density. This suggest F center kinetics in sapphire under low-energy low-fluence Ar irradiation is a direct consequence of dynamic competition between oxygen defect creation and recombination. An attempt has also been made to extend this discussion to F center kinetics in sapphire under swift heavy ion irradiation.

  10. Single-crystal sapphire tubes as economical probes for optical pyrometry in harsh environments

    SciTech Connect

    Ruzicka, Jakub; Houzvicka, Jindrich; Bok, Jiri; Praus, Petr; Mojzes, Peter

    2011-12-20

    One-end-sealed single-crystal sapphire tubes are presented as a simple, robust, and economical alternative for bulky lightpipe probes. Thermal radiation from a blackbody cavity created at the inner surface of the sealed end is gathered by a simple lens-based collecting system and transmitted via optical fiber to the remote detection unit. Simplicity and applicability of the concept are demonstrated by the combination of commercially available sapphire tubes with a common optical pyrometer. Radiation thermometers with sapphire tubes as invasive probes can be useful for applications requiring immunity to electromagnetic interference, resistance to harsh environments, simple replacement in the case of failure, and enhanced mechanical firmness, enabling wider range probe positioning inside the medium of interest.

  11. Single-crystal sapphire tubes as economical probes for optical pyrometry in harsh environments.

    PubMed

    Růžička, Jakub; Houžvička, Jindřich; Bok, Jiří; Praus, Petr; Mojzeš, Peter

    2011-12-20

    One-end-sealed single-crystal sapphire tubes are presented as a simple, robust, and economical alternative for bulky lightpipe probes. Thermal radiation from a blackbody cavity created at the inner surface of the sealed end is gathered by a simple lens-based collecting system and transmitted via optical fiber to the remote detection unit. Simplicity and applicability of the concept are demonstrated by the combination of commercially available sapphire tubes with a common optical pyrometer. Radiation thermometers with sapphire tubes as invasive probes can be useful for applications requiring immunity to electromagnetic interference, resistance to harsh environments, simple replacement in the case of failure, and enhanced mechanical firmness, enabling wider range probe positioning inside the medium of interest.

  12. Sapphire hard X-ray Fabry-Perot resonators for synchrotron experiments.

    PubMed

    Tsai, Yi Wei; Wu, Yu Hsin; Chang, Ying Yi; Liu, Wen Chung; Liu, Hong Lin; Chu, Chia Hong; Chen, Pei Chi; Lin, Pao Te; Fu, Chien Chung; Chang, Shih Lin

    2016-05-01

    Hard X-ray Fabry-Perot resonators (FPRs) made from sapphire crystals were constructed and characterized. The FPRs consisted of two crystal plates, part of a monolithic crystal structure of Al2O3, acting as a pair of mirrors, for the backward reflection (0 0 0 30) of hard X-rays at 14.3147 keV. The dimensional accuracy during manufacturing and the defect density in the crystal in relation to the resonance efficiency of sapphire FPRs were analyzed from a theoretical standpoint based on X-ray cavity resonance and measurements using scanning electron microscopic and X-ray topographic techniques for crystal defects. Well defined resonance spectra of sapphire FPRs were successfully obtained, and were comparable with the theoretical predictions.

  13. Surface characterization of diamond film tool grinding on the monocrystal sapphire under different liquid environments

    NASA Astrophysics Data System (ADS)

    Feng, Wei; Lu, Wenzhuang; Zhou, Hai; Yang, Bin; Zuo, Dunwen

    2016-11-01

    Surface characterization of diamond film tool on the monocrystal sapphire under H2O, 3% ethylene glycol and 3% ethylenediamine was investigated. The typical components and chemical changes of the surface of diamond thick film were studied by means of Raman and XPS. Results showed that tribological properties of diamond film tool were associated with the liquid environment located the grinding. Diamond film tool under 3% ethylenediamine solution exhibited the minimum value of friction coefficient, while that under H2O exhibited maximum value of friction coefficient. As the ethylenediamine and ethylene glycol were added during the grinding process, the reaction between diamond film and the sapphire pieces occurred, and the chemical composition change of the surface was also studied. Under the same process parameters, a better surface quality of sapphire under the grinding fluid of ethylenediamine can be obtained.

  14. Single-crystal sapphire tubes as economical probes for optical pyrometry in harsh environments.

    PubMed

    Růžička, Jakub; Houžvička, Jindřich; Bok, Jiří; Praus, Petr; Mojzeš, Peter

    2011-12-20

    One-end-sealed single-crystal sapphire tubes are presented as a simple, robust, and economical alternative for bulky lightpipe probes. Thermal radiation from a blackbody cavity created at the inner surface of the sealed end is gathered by a simple lens-based collecting system and transmitted via optical fiber to the remote detection unit. Simplicity and applicability of the concept are demonstrated by the combination of commercially available sapphire tubes with a common optical pyrometer. Radiation thermometers with sapphire tubes as invasive probes can be useful for applications requiring immunity to electromagnetic interference, resistance to harsh environments, simple replacement in the case of failure, and enhanced mechanical firmness, enabling wider range probe positioning inside the medium of interest. PMID:22193189

  15. Anisotropic structural and optical properties of semi-polar (11-22) GaN grown on m-plane sapphire using double AlN buffer layers.

    PubMed

    Zhao, Guijuan; Wang, Lianshan; Yang, Shaoyan; Li, Huijie; Wei, Hongyuan; Han, Dongyue; Wang, Zhanguo

    2016-02-10

    We report the anisotropic structural and optical properties of semi-polar (11-22) GaN grown on m-plane sapphire using a three-step growth method which consisted of a low temperature AlN buffer layer, followed by a high temperature AlN buffer layer and GaN growth. By introducing double AlN buffer layers, we substantially improve the crystal and optical qualities of semi-polar (11-22) GaN, and significantly reduce the density of stacking faults and dislocations. The high resolution x-ray diffraction measurement revealed that the in-plane anisotropic structural characteristics of GaN layer are azimuthal dependent. Transmission electron microscopy analysis showed that the majority of dislocations in the GaN epitaxial layer grown on m-sapphire are the mixed-type and the orientation of GaN layer was rotated 58.4° against the substrate. The room temperature photoluminescence (PL) spectra showed the PL intensity and wavelength have polarization dependence along parallel and perpendicular to the [1-100] axis (polarization degrees ~ 0.63). The realization of a high polarization semi-polar GaN would be useful to achieve III-nitride based lighting emission device for displays and backlighting.

  16. Anisotropic structural and optical properties of semi-polar (11–22) GaN grown on m-plane sapphire using double AlN buffer layers

    PubMed Central

    Zhao, Guijuan; Wang, Lianshan; Yang, Shaoyan; Li, Huijie; Wei, Hongyuan; Han, Dongyue; Wang, Zhanguo

    2016-01-01

    We report the anisotropic structural and optical properties of semi-polar (11–22) GaN grown on m-plane sapphire using a three-step growth method which consisted of a low temperature AlN buffer layer, followed by a high temperature AlN buffer layer and GaN growth. By introducing double AlN buffer layers, we substantially improve the crystal and optical qualities of semi-polar (11–22) GaN, and significantly reduce the density of stacking faults and dislocations. The high resolution x-ray diffraction measurement revealed that the in-plane anisotropic structural characteristics of GaN layer are azimuthal dependent. Transmission electron microscopy analysis showed that the majority of dislocations in the GaN epitaxial layer grown on m-sapphire are the mixed-type and the orientation of GaN layer was rotated 58.4° against the substrate. The room temperature photoluminescence (PL) spectra showed the PL intensity and wavelength have polarization dependence along parallel and perpendicular to the [1–100] axis (polarization degrees ~ 0.63). The realization of a high polarization semi-polar GaN would be useful to achieve III-nitride based lighting emission device for displays and backlighting. PMID:26861595

  17. Formation Mechanism of CuAlO2 Prepared by Rapid Thermal Annealing of Al2O3/Cu2O/Sapphire Sandwich Structure

    NASA Astrophysics Data System (ADS)

    Shih, C. H.; Tseng, B. H.

    Single-phase CuAlO2 films were successfully prepared by thin-film reaction of an Al2O3/Cu2O/sapphire sandwich structure. We found that the processing parameters, such as heating rate, holding temperature and annealing ambient, were all crucial to form CuAlO2 without second phases. Thermal annealing in pure oxygen ambient with a lower temperature ramp rate might result in the formation of CuAl2O4 in addition to CuAlO2, since part of Cu2O was oxidized to form CuO and caused the change in reaction path, i.e. CuO + Al2O3 → CuAl2O4. Typical annealing conditions successful to prepare single-phase CuAlO2 would be to heat the sample with a temperature rampt rate higher than 7.3 °C/sec and hold the temperature at 1100 °C in air ambient. The formation mechanism of CuAlO2 has also been studied by interrupting the reaction after a short period of annealing. TEM observations showed that the top Al2O3 layer with amorphous structure reacted immediately with Cu2O to form CuAlO2 in the early stage and then the remaining Cu2O reacted with the sapphire substrate.

  18. Transformation of c-oriented nanowall network to a flat morphology in GaN films on c-plane sapphire

    SciTech Connect

    Kesaria, Manoj; Shetty, Satish; Cohen, P.I.; Shivaprasad, S.M.

    2011-11-15

    Highlights: {yields} High quality wurtzite structures GaN nanowall network formed on c-plane sapphire. {yields} Tapering of nanowalls at the apex cause electron confinement effects. {yields} Temperature dependent transformation of the six fold nanowall network to a flat morphology. {yields} Growth kinetics is influenced by adatom diffusion, interactions and bonding for GaN layer. -- Abstract: The work significantly optimizes growth parameters for nanostructured and flat GaN film in the 480-830 {sup o}C temperature range. The growth of ordered, high quality GaN nanowall hexagonal honeycomb like network on c-plane sapphire under nitrogen rich (N/Ga ratio of 100) conditions at temperatures below 700 {sup o}C is demonstrated. The walls are c-oriented wurtzite structures 200 nm wide at base and taper to 10 nm at apex, manifesting electron confinement effects to tune optoelectronic properties. For substrate temperatures above 700 {sup o}C the nanowalls thicken to a flat morphology with a dislocation density of 10{sup 10}/cm{sup 2}. The role of misfit dislocations in the GaN overlayer evolution is discussed in terms of growth kinetics being influenced by adatom diffusion, interactions and bonding at different temperatures. The GaN films are characterized by reflection high energy electron diffraction (RHEED), field emission scanning electron (FESEM), high resolution X-ray diffraction (HRXRD) and cathodoluminescence (CL).

  19. 78 FR 56691 - Sapphire Power Marketing LLC; Supplemental Notice That Initial Market-Based Rate Filing Includes...

    Federal Register 2010, 2011, 2012, 2013, 2014

    2013-09-13

    ... Energy Regulatory Commission Sapphire Power Marketing LLC; Supplemental Notice That Initial Market-Based... above-referenced proceeding, of Sapphire Power Marketing LLC's application for market-based rate...://www.ferc.gov . To facilitate electronic service, persons with Internet access who will eFile...

  20. High-power Ti:sapphire lasers for spectroscopy of antiprotonic atoms and radioactive ions

    NASA Astrophysics Data System (ADS)

    Hori, M.; Dax, A.; Soter, A.

    The ASACUSA collaboration has developed injection-seeded Ti:sapphire lasers of linewidth Γpl ˜ 6 MHz, pulse energy 50-100 mJ, and output wavelength λ = 726-941 nm. They are being used in two-photon spectroscopy experiments of antiprotonic helium atoms at the Antiproton Decelerator (AD) of CERN. Ti:sapphire lasers of larger linewidth Γpl ˜ 100 MHz but more robust design will also be used in collinear resonance ionization spectroscopy (CRIS) experiments of neutron-deficient francium ions at the ISOLDE facility.

  1. High-power Ti:sapphire lasers for spectroscopy of antiprotonic atoms and radioactive ions

    NASA Astrophysics Data System (ADS)

    Hori, M.; Dax, A.; Soter, A.

    2012-12-01

    The ASACUSA collaboration has developed injection-seeded Ti:sapphire lasers of linewidth Γpl ˜ 6 MHz, pulse energy 50-100 mJ, and output wavelength λ = 726-941 nm. They are being used in two-photon spectroscopy experiments of antiprotonic helium atoms at the Antiproton Decelerator (AD) of CERN. Ti:sapphire lasers of larger linewidth Γpl ˜ 100 MHz but more robust design will also be used in collinear resonance ionization spectroscopy (CRIS) experiments of neutron-deficient francium ions at the ISOLDE facility.

  2. Design and analysis of large-core single-mode windmill single crystal sapphire optical fiber

    NASA Astrophysics Data System (ADS)

    Cheng, Yujie; Hill, Cary; Liu, Bo; Yu, Zhihao; Xuan, Haifeng; Homa, Daniel; Wang, Anbo; Pickrell, Gary

    2016-06-01

    We present a large-core single-mode "windmill" single crystal sapphire optical fiber (SCSF) design, which exhibits single-mode operation by stripping off the higher-order modes (HOMs) while maintaining the fundamental mode. The "windmill" SCSF design was analyzed using the finite element analysis method, in which all the HOMs are leaky. The numerical simulation results show single-mode operation in the spectral range from 0.4 to 2 μm in the windmill SCSF, with an effective core diameter as large as 14 μm. Such fiber is expected to improve the performance of many of the current sapphire fiber optic sensor structures.

  3. Blocks and residual stresses in sapphire rods of different crystallographic orientations grown by the Stepanov method

    SciTech Connect

    Krymov, V. M. Nosov, Yu. G.; Bakholdin, S. I.; Maslov, V. N.; Shul’pina, I. L.

    2015-05-15

    The formation of blocks in shaped sapphire rods of two crystallographic orientations has been investigated. It is shown that, when growth occurs in the direction of the optical c axis, blocks are formed with a higher probability than in the case of growth in the a direction. A model of formation of blocks in rods of different orientations is proposed. The distribution of residual stresses over sapphire rod cross sections is measured by conoscopy. It is found that stresses increase from the middle of a rod to its periphery and reach 20 MPa.

  4. Analysis of the growth dependences of silicon-on-sapphire heteroepitaxy

    SciTech Connect

    Pavlov, D. A.; Shilyaev, P. A.; Pirogov, A. V. Krivulin, N. O. Bobrov, A. I.; Pegasina, M. D.

    2013-06-15

    The formation of nanoislands of two forms (dome-shaped and a truncated dome) is experimentally found during the initial stage of silicon-on-sapphire heteroepitaxy. Atomic-resolution images of the silicon islands on sapphire are obtained by transmission electron microscopy. A model is proposed to explain the instability of the shape of islands and its transition from isotropic to anisotropic and to describe the evolution of average island sizes during growth. It is shown that the height dependence of the island diameter is approximately linear; however, for large island sizes there is a significant discrepancy with the experimental data due to island coalescence, which is disregarded in the model.

  5. Incident beam polarization for laser Doppler velocimetry employing a sapphire cylindrical window

    NASA Technical Reports Server (NTRS)

    Lock, J. A.; Schock, H. J.

    1985-01-01

    For laser Doppler velocimetry studies employing sapphire windows as optical access ports, the birefringency of sapphire produces an extra beam intersection volume which serves to effectively smear the acquired velocity flow field data. It is shown that for a cylindrical window geometry, the extra beam intersection volume may be eliminated with minimal decrease in the fringe visibility of the remaining intersection volume by suitably orienting the polarizations of the initial laser beams. For horizontally incident beams, these polarizations were measured at three intersection locations within the cylinder. It was found that the measured polarization angles agreed with the theoretical predictions.

  6. Ti:Sapphire micro-structures by femtosecond laser inscription: Guiding and luminescence properties

    NASA Astrophysics Data System (ADS)

    Ren, Yingying; Jiao, Yang; Vázquez de Aldana, Javier R.; Chen, Feng

    2016-08-01

    We report on the fabrication of buried cladding waveguides with different diameters in a Ti:Sapphire crystal by femtosecond laser inscription. The propagation properties are studied, showing that the cladding waveguides could support near- to mid-infrared waveguiding at both TE and TM polarizations. Confocal micro-photoluminescence experiments reveal that the original fluorescence properties in the waveguide region are very well preserved, while it suffers from a strong quenching at the centers of laser induced filaments. Broadband waveguide fluorescence emissions with high efficiency are realized, indicating the application of the cladding waveguides in Ti:Sapphire as compact broadband luminescence sources in biomedical fields.

  7. Synthesis of ZnO nanocrystals in sapphire by ion implantation and vacuum annealing

    NASA Astrophysics Data System (ADS)

    Marques, C.; Franco, N.; Alves, L. C.; da Silva, R. C.; Alves, E.; Safran, G.; McHargue, C. J.

    2007-04-01

    The synthesis of embedded ZnO nanoparticles in m-cut sapphire was achieved through high fluence Zn ion implantation, 0.9 × 1017 cm-2 at room temperature, followed by annealing at 1000 °C in vacuum. In c-cut samples subjected to similar annealing conditions only buried precipitates of Zn form. TEM results in these samples show a high concentration of faceted precipitates distributed along the c-plane and the presence of Kirkendall voids distributed along the entire implanted region. In both cases a strong loss of Zn is observed upon annealing, which depends on the sapphire host orientation.

  8. Introduction of SILEX-I Femto-second Ti:sapphire laser Facility

    NASA Astrophysics Data System (ADS)

    Zhu, Qihua; Peng, Hansheng; Wei, Xiaofeng; Huang, Xiaojun; Zhang, Xiaomin; Wang, Xiaodong; Zhou, Kainan; Liu, Lanqin; Zeng, Xiaoming; Wang, Xiao; Guo, Yi; Lin, Donghui; Xu, Bing; Chu, Xiaoling

    2007-06-01

    We have built a Ti:sapphire laser system, referred to as SILEX-I, with a peak power of 286TW for a pulse duration of 30fs using chirped-pulse amplification technique. A number of spectral and spatio-temporal beam control measures have been taken and near-diffraction limited focal spots have been obtained which, to our knowledge, are the best far fields ever measured for any existing high-power Ti:sapphire laser system without deformable mirror corrections.

  9. Novel substrates.

    PubMed

    Wahed, Mahmood; Geoghegan, Michael; Powell-Tuck, Jeremy

    2007-05-01

    Enteral and parenteral feeds need at least to contain adequate amounts of water, energy, protein, electrolytes, vitamins and trace elements. Ready-manufactured parenteral feeds for example are incomplete because of shelf-life constraints and require the addition of vitamins (especially) and trace elements. Acute vitamin deficiencies, notably thiamine deficiency, can be precipitated if this is not adhered to. An increasing interest, however, exists in the use of feeds containing substrates, which are intended to improve patient outcome in particular clinical circumstances. The purpose of this article is to examine as to what is available and make recommendations on their use. It deals with artificial feeds only - disease-specific diets are outside our remit.

  10. Channel Temperature Determination for AlGaN/GaN HEMTs on SiC and Sapphire

    NASA Technical Reports Server (NTRS)

    Freeman, Jon C.; Mueller, Wolfgang

    2008-01-01

    Numerical simulation results (with emphasis on channel temperature) for a single gate AlGaN/GaN High Electron Mobility Transistor (HEMT) with either a sapphire or SiC substrate are presented. The static I-V characteristics, with concomitant channel temperatures (T(sub ch)) are calculated using the software package ATLAS, from Silvaco, Inc. An in-depth study of analytical (and previous numerical) methods for the determination of T(sub ch) in both single and multiple gate devices is also included. We develop a method for calculating T(sub ch) for the single gate device with the temperature dependence of the thermal conductivity of all material layers included. We also present a new method for determining the temperature on each gate in a multi-gate array. These models are compared with experimental results, and show good agreement. We demonstrate that one may obtain the channel temperature within an accuracy of +/-10 C in some cases. Comparisons between different approaches are given to show the limits, sensitivities, and needed approximations, for reasonable agreement with measurements.

  11. Growth mechanism and electronic properties of epitaxial In{sub 2}O{sub 3} films on sapphire

    SciTech Connect

    Wang, Ch. Y.; Kirste, L.; Roehlig, C. C.; Koehler, K.; Cimalla, V.; Ambacher, O.; Morales, F. M.; Manuel, J. M.; Garcia, R.

    2011-11-01

    In this work, we report on the epitaxial growth of high-quality cubic indium oxide thick films on c-plane sapphire substrates using a two-step growth process. The epitaxial relationship of In{sub 2}O{sub 3} on (0001) Al{sub 2}O{sub 3} has been investigated. The (222) plane spacing and lattice parameter of a most strain-relaxed high-quality In{sub 2}O{sub 3} film have been determined to be 292.58 pm and 1013.53 pm, respectively. The electronic properties in dependence of the film thickness are interpreted using a three-region model. The density at the surface and interface totals (3.3{+-}1.5)x10{sup 13}cm{sup -2}, while the background electron density in the bulk was determined to be (2.4{+-}0.5)x10{sup 18}cm{sup -3}. Furthermore, post treatments such as irradiation via ultraviolet light and ozone oxidation have been found to influence only the surface layer, while the bulk electronic properties remain unchanged.

  12. On compensation and impurities in state-of-the-art GaN epilayers grown on sapphire

    SciTech Connect

    Wickenden, A.E.; Gaskill, D.K.; Koleske, D.D.; Doverspike, K.; Simons, D.S.; Chi, P.H.

    1996-11-01

    A comparison between 300 K electron transport data for state-of-the-art wurtzite GaN grown on sapphire substrates and corresponding theoretical calculations shows a large difference, with experimental mobility less than the predicted mobility for a given carrier concentration. The comparison seems to imply that GaN films are greatly compensated, but the discrepancy may also be due to the poorly known values of the materials parameters used in the calculations. In this work, recent analysis of transport and SIMS measurements on silicon-doped GaN films are shown to imply that the compensation, N{sub A}/N{sub D}, is less than 0.3. In addition, the determination of an activation energy of 34 meV in a GaN film doped to a level of 6 {times} 10{sup 16} cm{sup {minus}3} suggests either that a second, native donor exists in the doped films at a level of between 6 {times} 10{sup 16} cm{sup {minus}3} and 1 {times} 10{sup 17} cm{sup {minus}3}, or that the activation energy of Si in GaN is dependent on the concentration, being influenced by impurity banding or some other physical effect. GaN films grown without silicon doping are highly resistive.

  13. Surface tension of liquid Al-Cu and wetting at the Cu/Sapphire solid-liquid interface

    NASA Astrophysics Data System (ADS)

    Schmitz, J.; Brillo, J.; Egry, I.

    2014-02-01

    For the study of the interaction of a liquid alloy with differently oriented single crystalline sapphire surfaces precise surface tension data of the liquid are fundamental. We measured the surface tension of liquid Al-Cu contactlessly on electromagnetically levitated samples using the oscillating drop technique. Data were obtained for samples covering the entire range of composition and in a broad temperature range. The surface tensions can be described as linear functions of temperature with negative slopes. Moreover, they decrease monotonically with an increase of aluminium concentration. The observed behaviour with respect to both temperature and concentration is in agreement with a thermodynamic model calculation using the regular solution approximation. Surface tensions were used to calculate interfacial energies from the contact angles of liquid Cu droplets, deposited on the C(0001), A(11-20), R(1-102) surfaces of an α-Al2O3 substrate. The contact angles were measured by means of the sessile drop method at 1380 K. In the Cu/α-Al2O3 system, no anisotropy is evident neither for the contact angles nor for the interfacial energies of different surfaces. The work of adhesion of this system is isotropic, too.

  14. Optical and structural properties of BGaN layers grown on different substrates

    NASA Astrophysics Data System (ADS)

    Kadys, A.; Mickevičius, J.; Malinauskas, T.; Jurkevičius, J.; Kolenda, M.; Stanionytė, S.; Dobrovolskas, D.; Tamulaitis, G.

    2015-11-01

    Growth of BGaN epitaxial layers by metalorganic chemical vapor deposition (MOCVD) using triethylboron (TEB) as a boron source was studied on 6H-SiC substrate and on GaN and AlN templates on sapphire. X-ray diffraction, atomic force microscopy and photoluminescence spectroscopy were exploited to characterize the structural quality, surface morphology, luminescence efficiency, and boron content. Silicon carbide was shown to be slightly superior to AlN/sapphire and considerably better than GaN/sapphire as the most favorable substrate to incorporate a possibly higher boron content. Increasing TEB flow rate at correspondingly optimized growth temperature and V/III ratio enabled us to achieve the boron content of up to 5.5%, though at the expense of structural quality. We showed that the band gap bowing parameter is similar for the epilayers deposited on all the three templates/substrates under study and is approximately equal to 4 eV, substantially lower than reported before.

  15. Response to “Comment on ‘Twin symmetry texture of energetically condensed niobium thin films on sapphire substrate’ ” [J. Appl. Phys. 112, 016101 (2012)

    DOE PAGES

    Zhao, X.; Philips, L.; Reece, C. E.; Seo, Kang; Krishnan, M.; Valderrama, E.

    2012-07-01

    Welander is correct about the misidentified crystal-directions in the top-view sapphire lattice (Fig. 4 [Zhao et al., J. Appl. Phys. 110, 033523 (2011)]). He is also correct about the misorientation of the pole figures in Fig. 4. In Fig. 1 of this response, we have corrected these errors. Perhaps because of these errors, Welander misconstrued our discussion of the Nbcrystal growth as claiming a new 3D registry. That was not our intention. Rather, we wished to highlight the role of energetic condensation that drives low-defect crystal growth by a combination of non-equilibrium sub-plantation that disturbs the substrate lattice and thermalmore » annealing that annihilates defects and promotes large-grain crystal growth.« less

  16. Single crystalline Er{sub 2}O{sub 3}:sapphire films as potentially high-gain amplifiers at telecommunication wavelength

    SciTech Connect

    Kuznetsov, A. S.; Sadofev, S.; Schäfer, P.; Kalusniak, S.; Henneberger, F.

    2014-11-10

    Single crystalline thin films of Er{sub 2}O{sub 3}, demonstrating efficient 1.5 μm luminescence of Er{sup 3+} at room temperature were grown on Al{sub 2}O{sub 3} substrate by molecular beam epitaxy. The absorption coefficient at 1.536 μm was found to reach 270 cm{sup −1} translating in a maximal possible gain of 1390 dBcm{sup −1}. In conjunction with the 10% higher refractive index as compared to Al{sub 2}O{sub 3}, this opens the possibility to use Er{sub 2}O{sub 3}:sapphire films as short-length waveguide amplifiers in telecommunication.

  17. Nobel Lecture: Growth of GaN on sapphire via low-temperature deposited buffer layer and realization of p -type GaN by Mg doping followed by low-energy electron beam irradiation*

    NASA Astrophysics Data System (ADS)

    Amano, Hiroshi

    2015-10-01

    This is a personal history of one of the Japanese researchers engaged in developing a method for growing GaN on a sapphire substrate, paving the way for the realization of smart television and display systems using blue LEDs. The most important work was done in the mid to late 1980s. The background to the author's work and the process by which the technology enabling the growth of GaN and the realization of p -type GaN was established are reviewed.

  18. Growth of GaN on Sapphire via Low-Temperature Deposited Buffer Layer and Realization of p-Type GaN by Mg Doping Followed by Low-Energy Electron Beam Irradiation

    NASA Astrophysics Data System (ADS)

    Amano, Hiroshi

    2015-12-01

    This is a personal history of one of the Japanese researchers engaged in developing a method for growing GaN on a sapphire substrate, paving the way for the realization of smart television and display systems using blue LEDs. The most important work was done in the mid- to late 80s. The background to the author's work and the process by which the technology enabling the growth of GaN and the realization of p-type GaN was established are reviewed.

  19. Vanadium-rich ruby and sapphire within Mogok Gemfield, Myanmar: implications for gem color and genesis

    NASA Astrophysics Data System (ADS)

    Zaw, Khin; Sutherland, Lin; Yui, Tzen-Fu; Meffre, Sebastien; Thu, Kyaw

    2015-01-01

    Rubies and sapphires are of both scientific and commercial interest. These gemstones are corundum colored by transition elements within the alumina crystal lattice: Cr3+ yields red in ruby and Fe2+, Fe3+, and Ti4+ ionic interactions color sapphires. A minor ion, V3+ induces slate to purple colors and color change in some sapphires, but its role in coloring rubies remains enigmatic. Trace element and oxygen isotope composition provide genetic signatures for natural corundum and assist geographic typing. Here, we show that V can dominate chromophore contents in Mogok ruby suites. This raises implications for their color quality, enhancement treatments, geographic origin, exploration and exploitation and their comparison with rubies elsewhere. Precise LA-ICP-MS analysis of ruby and sapphire from Mogok placer and in situ deposits reveal that V can exceed 5,000 ppm, giving V/Cr, V/Fe and V/Ti ratios up to 26, 78, and 97 respectively. Such values significantly exceed those found elsewhere suggesting a localized geological control on V-rich ruby distribution. Our results demonstrate that detailed geochemical studies of ruby suites reveal that V is a potential ruby tracer, encourage comparisons of V/Cr-variation between ruby suites and widen the scope for geographic typing and genesis of ruby. This will allow more precise comparison of Asian and other ruby fields and assist confirmation of Mogok sources for rubies in historical and contemporary gems and jewelry.

  20. Transmittance enhancement of sapphires with antireflective subwavelength grating patterned UV polymer surface structures by soft lithography.

    PubMed

    Lee, Soo Hyun; Leem, Jung Woo; Yu, Jae Su

    2013-12-01

    We report the total and diffuse transmission enhancement of sapphires with the ultraviolet curable SU8 polymer surface structures consisting of conical subwavelength gratings (SWGs) at one- and both-side surfaces for different periods. The SWGs patterns on the silicon templates were transferred into the SU8 polymer film surface on sapphires by a simple and cost-effective soft lithography technique. For the fabricated samples, the surface morphologies, wetting behaviors, and optical characteristics were investigated. For theoretical optical analysis, a rigorous coupled-wave analysis method was used. At a period of 350 nm, the sample with SWGs on SU8 film/sapphire exhibited a hydrophobic surface and higher total transmittance compared to the bare sapphire over a wide wavelength of 450-1000 nm. As the period of SWGs was increased, the low total transmittance region of < 85% was shifted towards the longer wavelengths and became broader while the diffuse transmittance was increased (i.e., larger haze ratio). For the samples with SWGs at both-side surfaces, the total and diffuse transmittance spectra were further enhanced compared to the samples with SWGs at one-side surface. The theoretical optical calculation results showed a similar trend to the experimentally measured data. PMID:24514482

  1. Titanium: Sapphire laser as an excitation source in two-photon spectroscopy

    SciTech Connect

    Fisher, W.G.; Wachter, E.A.; Armas, M.; Seaton, C.

    1997-02-01

    The passively mode-locked titanium:sapphire laser provides new opportunities for acquiring two-photon spectral data in the near-infrared, a region not commonly accessible to synchronously pumped dye lasers. This source generates pulses with peak powers near 100 kW at average powers over 1 W and is capable of yielding two-photon signals roughly two orders of magnitude larger than is possible with synchronously pumped dye lasers. However, the multimode output of this laser exhibits significant temporal and spectral pulse profile variations as the laser wavelength is tuned. As a consequence, peak powers of the titanium:sapphire laser can vary independently from average power across the tuning range. This wavelength dependence, coupled with the quadratic dependence of the two-photon signal upon the instantaneous power of the laser, precludes simple average power correction of nonlinear spectral band shapes. Here, we investigate the key properties of the titanium:sapphire laser as an excitation source for two-photon spectroscopy. We also identify a chemical reference suitable for obtaining source-corrected excitation spectra in the near-infrared using a double-beam, ratiometric approach; this is based on a source-independent two-photon excitation spectrum for the laser dye coumarin-480 that has been obtained with a single-frequency titanium:sapphire laser. From these data, correction factors are generated for correction of multimode source data. {copyright} {ital 1997} {ital Society for Applied Spectroscopy}

  2. A mechanically compensated sapphire oscillator optimized for operation at 40 Kelvin

    NASA Technical Reports Server (NTRS)

    Dick, G. J.; Wang, R. T.

    2000-01-01

    We present features for a second-generation thermomechanically compensated sapphire resonator. The new design shares the short thermal time constants characteristic of previously developed 10K and 77K CSO resonators. This, together with a thermal ballast methodology, allows effective compensation of temperature fluctuations over a wide range of time scales.

  3. In situ measurement of complete intracavity dispersion in an operating Ti:sapphire femtosecond laser.

    PubMed

    Knox, W H

    1992-04-01

    Broadband measurements of the frequency-dependent group delay in a Ti:sapphire passive mode-locked laser operating at a 100-fs pulse width under various conditions are reported. From these measurements one can determine the dispersive limits and the connection between dispersion and mode-locking stability in the self-mode-locked regime. PMID:19794543

  4. Mathematical modeling of a Ti:sapphire solid-state laser

    NASA Technical Reports Server (NTRS)

    Swetits, John J.

    1987-01-01

    The project initiated a study of a mathematical model of a tunable Ti:sapphire solid-state laser. A general mathematical model was developed for the purpose of identifying design parameters which will optimize the system, and serve as a useful predictor of the system's behavior.

  5. Transmittance enhancement of sapphires with antireflective subwavelength grating patterned UV polymer surface structures by soft lithography.

    PubMed

    Lee, Soo Hyun; Leem, Jung Woo; Yu, Jae Su

    2013-12-01

    We report the total and diffuse transmission enhancement of sapphires with the ultraviolet curable SU8 polymer surface structures consisting of conical subwavelength gratings (SWGs) at one- and both-side surfaces for different periods. The SWGs patterns on the silicon templates were transferred into the SU8 polymer film surface on sapphires by a simple and cost-effective soft lithography technique. For the fabricated samples, the surface morphologies, wetting behaviors, and optical characteristics were investigated. For theoretical optical analysis, a rigorous coupled-wave analysis method was used. At a period of 350 nm, the sample with SWGs on SU8 film/sapphire exhibited a hydrophobic surface and higher total transmittance compared to the bare sapphire over a wide wavelength of 450-1000 nm. As the period of SWGs was increased, the low total transmittance region of < 85% was shifted towards the longer wavelengths and became broader while the diffuse transmittance was increased (i.e., larger haze ratio). For the samples with SWGs at both-side surfaces, the total and diffuse transmittance spectra were further enhanced compared to the samples with SWGs at one-side surface. The theoretical optical calculation results showed a similar trend to the experimentally measured data.

  6. Light refraction in sapphire plates with a variable angle of crystal optical axis to the surface

    SciTech Connect

    Vetrov, V. N. Ignatenkov, B. A.

    2013-05-15

    The modification of sapphire by inhomogeneous plastic deformation makes it possible to obtain plates with a variable angle of inclination of the crystal optical axis to the plate surface. The refraction of light in this plate at perpendicular and oblique incidence of a parallel beam of rays is considered. The algorithm of calculating the refractive index of extraordinary ray and the birefringence is proposed.

  7. "You Hafta Push": Using Sapphire's Novel to Teach Introduction to American Government

    ERIC Educational Resources Information Center

    Pappas, Christine

    2007-01-01

    Using fiction in the classroom can dramatize public policy issues and political science concepts, therefore, making them more real and relevant to students. Sapphire's 1996 novel "Push" puts a face on welfare, rape, incest, child abuse, educational inequalities, homophobia, and AIDS. I also use this novel to discuss the public policy process,…

  8. Absorption of Near UV Light by HNO3/NO3(-) on Sapphire Surfaces.

    PubMed

    Sangwan, Manuvesh; Stockwell, William R; Stewart, Devoun; Zhu, Lei

    2016-05-12

    We have determined absorption of the near UV light (290-345 nm) by nitric acid (HNO3) deposition on sapphire window surfaces as a function of the HNO3 pressure, by using Brewster angle cavity ring-down spectroscopy. Apparent monolayer HNO3 surface absorption cross sections have been obtained; they range between (1.7 ± 1.1) × 10(-19) and (0.29 ± 0.03) × 10(-19) cm(2)/molecule. When nitric acid cross section values on sapphire surfaces were divided by those on fused silica surfaces for which only molecular HNO3 adsorption was reported, a new absorption band appeared in the 320-345 nm region. The shape of this absorption band is similar to that reported for surface nitrate (NO3(-)) at quartz/water interfaces, but is red-shifted by about 10 nm. Our study suggests that a small percentage (<7%) of adsorbed HNO3 formed by HNO3 deposition on sapphire surfaces is dissociated into surface nitrate on the time scale of about 5-7 min. Background transmission changes in the 320-350 nm region after exposing clean sapphire surfaces with many repeated HNO3 deposition/evacuation cycles are consistent with surface nitrate formation. We obtained nitrate surface absorption cross section data over 320-350 nm range. We also modeled photolysis rates of HNO3/NO3(-) on urban grimes. Atmospheric implications of the results are discussed.

  9. Contact application of Nd:YAG laser through a fiberoptic and a sapphire tip.

    PubMed

    Peyman, G A; Katoh, N; Tawakol, M; Khoobehi, B; Desai, A

    1987-10-01

    We evaluated the effects of Nd:YAG laser energy directly applied to ocular tissue through a fiberoptic and a sapphire tip. All ocular tissue could be easily cut with the maximum 4 watts of energy. The coagulated borders extended 20 to 200 mu into the healthy tissue depending on the speed with which the cutting was performed.

  10. Quasi ?non-destructive? laser ablation-inductively coupled plasma-mass spectrometry fingerprinting of sapphires

    NASA Astrophysics Data System (ADS)

    Guillong, M.; Günther, D.

    2001-07-01

    A homogenized 193 nm excimer laser with a flat-top beam profile was used to study the capabilities of LA-ICP-MS for 'quasi' non-destructive fingerprinting and sourcing of sapphires from different locations. Sapphires contain 97-99% of Al 2O 3 (corundum), with the remainder composed of several trace elements, which can be used to distinguish the origin of these gemstones. The ablation behavior of sapphires, as well as the minimum quantity of sample removal that is required to determine these trace elements, was investigated. The optimum ablation conditions were a fluency of 6 J cm -2, a crater diameter of 120 μm, and a laser repetition rate of 10 Hz. The optimum time for the ablation was determined to be 2 s, equivalent to 20 laser pulses. The mean sample removal was 60 nm per pulse (approx. 3 ng per pulse). This allowed satisfactory trace element determination, and was found to cause the minimum amount of damage, while allowing for the fingerprinting of sapphires. More than 40 isotopes were measured using different spatial resolutions (20-120 μm) and eight elements were reproducibly detected in 25 sapphire samples from five different locations. The reproducibility of the trace element distribution is limited by the heterogeneity of the sample. The mean of five or more replicate analyses per sample was used. Calibration was carried out using NIST 612 glass reference material as external standard. The linear dynamic range of the ICP-MS (nine orders of magnitude) allowed the use of Al, the major element in sapphire, as an internal standard. The limits of detection for most of the light elements were in the μg g -1 range and were better for heavier elements (mass >85), being in the 0.1 μg g -1 range. The accuracy of the determinations was demonstrated by comparison with XRF analyses of the same set of samples. Using the quantitative analyses obtained using LA-ICP-MS, natural sapphires from five different origins were statistically classified using ternary plots and

  11. Removal of Lattice Imperfections that Impact the Optical Quality of Ti:Sapphire using Advanced Magnetorheological Finishing Techniques

    SciTech Connect

    Menapace, J A; Schaffers, K I; Bayramian, A J; Davis, P J; Ebbers, C A; Wolfe, J E; Caird, J A; Barty, C J

    2008-02-26

    Advanced magnetorheological finishing (MRF) techniques have been applied to Ti:sapphire crystals to compensate for sub-millimeter lattice distortions that occur during the crystal growing process. Precise optical corrections are made by imprinting topographical structure onto the crystal surfaces to cancel out the effects of the lattice distortion in the transmitted wavefront. This novel technique significantly improves the optical quality for crystals of this type and sets the stage for increasing the availability of high-quality large-aperture sapphire and Ti:sapphire optics in critical applications.

  12. GaN-Ready Aluminum Nitride Substrates for Cost-Effective, Very Low Dislocation Density III-Nitride LED's

    SciTech Connect

    Sandra Schujman; Leo Schowalter

    2010-10-15

    The objective of this project was to develop and then demonstrate the efficacy of a costeffective approach for a low defect density substrate on which AlInGaN LEDs can be fabricated. The efficacy of this “GaN-ready” substrate would then be tested by growing high efficiency, long lifetime InxGa1-xN blue LEDs. The approach used to meet the project objectives was to start with low dislocation density AlN single-crystal substrates and grow graded AlxGa1-xN layers on top. Pseudomorphic AlxGa1-xN epitaxial layers grown on bulk AlN substrates were used to fabricate light emitting diodes and demonstrate better device performance as a result of the low defect density in these layers when benched marked against state-of-the-art LEDs fabricated on sapphire substrates. The pseudomorphic LEDs showed excellent output powers compared to similar wavelength devices grown on sapphire substrates, with lifetimes exceeding 10,000 hours (which was the longest time that could reliably be estimated). In addition, high internal quantum efficiencies were demonstrated at high driving current densities even though the external quantum efficiencies were low due to poor photon extraction. Unfortunately, these pseudomorphic LEDs require high Al content so they emit in the ultraviolet. Sapphire based LEDs typically have threading dislocation densities (TDD) > 108 cm-2 while the pseudomorphic LEDs have TDD ≤ 105 cm-2. The resulting TDD, when grading the AlxGa1-xN layer all the way to pure GaN to produce a “GaN-ready” substrate, has varied between the mid 108 down to the 106 cm-2. These inconsistencies are not well understood. Finally, an approach to improve the LED structures on AlN substrates for light extraction efficiency was developed by thinning and roughening the substrate.

  13. Growth modes and epitaxy of FeAl thin films on a-cut sapphire prepared by pulsed laser and ion beam assisted deposition

    SciTech Connect

    Yao, Xiang; Trautvetter, Moritz; Ziemann, Paul; Wiedwald, Ulf

    2014-01-14

    FeAl films around equiatomic composition are grown on a-cut (112{sup ¯}0) sapphire substrates by ion beam assisted deposition (IBAD) and pulsed laser deposition (PLD) at ambient temperature. Subsequent successive annealing is used to establish chemical order and crystallographic orientation of the films with respect to the substrate. We find a strongly [110]-textured growth for both deposition techniques. Pole figures prove the successful preparation of high quality epitaxial films by PLD with a single in-plane orientation. IBAD-grown films, however, exhibit three in-plane orientations, all of them with broad angular distributions. The difference of the two growth modes is attributed to the existence of a metastable intermediate crystalline orientation as concluded from nonassisted sputter depositions at different substrate temperatures. The formation of the chemically ordered crystalline B2 phase is accompanied by the expected transition from ferromagnetic to paramagnetic behavior of the films. In accordance with the different thermally induced structural recovery, we find a step-like magnetic transition to paramagnetic behavior after annealing for 1 h at T{sub A} = 300 °C for IBAD deposition, while PLD-grown films show a gradual decrease of ferromagnetic signals with rising annealing temperatures.

  14. Diamond LED substrate and novel quantum dots.

    PubMed

    Sung, James C; Sung, Michael

    2009-02-01

    Nitride LED (e.g., GaN) has become the mainstream of blue light source. The blue light can be converted to white light by exciting a phosphor (e.g., Nichia's YAG or Osram's TAG) with the complementary yellow emission. However, GaN is typically deposited on sapphire (Al2O3) substrates formed by crystal pulling or hexagonal (e.g., 4 H or 6 H) SiC wafers condensed from SiC vapor. In either case, the nitride lattice is ridden (e.g., 10(9)/cm2) with dislocations. The high dislocation density with sapphire is due to the large (>13%) lattice mismatch; and with hexagonal SiC, because of intrinsic defects. Cubic (beta) SiC may be deposited epitaxially using a CVD reactor onto silicon wafer by diffusing the interface and by chemical gradation. A reactive echant (e.g., hydrogen or fluorine) can be introduced periodically to gasify mis-aligned atoms. In this case, large single crystal wafers would be available for the manufacture of high bright LED with superb electro-optical efficiency. The SiC wafer may be coated with diamond film that can eliminate heat in real time. As a result of lower temperature, the nitride LED can be brighter and it will last longer. The blue light of GaN LED formed on SiC on Diamond (SiCON) LED may also be scattered by using novel quantum dots (e.g., 33 atom pairs of CdSe) to form a broad yellow light that blend in with the original blue light to form sunlight-like white light. This would be the ideal source for general illumination (e.g., for indoor) or backlighting (e.g., for LCD). PMID:19441383

  15. Diamond LED substrate and novel quantum dots.

    PubMed

    Sung, James C; Sung, Michael

    2009-02-01

    Nitride LED (e.g., GaN) has become the mainstream of blue light source. The blue light can be converted to white light by exciting a phosphor (e.g., Nichia's YAG or Osram's TAG) with the complementary yellow emission. However, GaN is typically deposited on sapphire (Al2O3) substrates formed by crystal pulling or hexagonal (e.g., 4 H or 6 H) SiC wafers condensed from SiC vapor. In either case, the nitride lattice is ridden (e.g., 10(9)/cm2) with dislocations. The high dislocation density with sapphire is due to the large (>13%) lattice mismatch; and with hexagonal SiC, because of intrinsic defects. Cubic (beta) SiC may be deposited epitaxially using a CVD reactor onto silicon wafer by diffusing the interface and by chemical gradation. A reactive echant (e.g., hydrogen or fluorine) can be introduced periodically to gasify mis-aligned atoms. In this case, large single crystal wafers would be available for the manufacture of high bright LED with superb electro-optical efficiency. The SiC wafer may be coated with diamond film that can eliminate heat in real time. As a result of lower temperature, the nitride LED can be brighter and it will last longer. The blue light of GaN LED formed on SiC on Diamond (SiCON) LED may also be scattered by using novel quantum dots (e.g., 33 atom pairs of CdSe) to form a broad yellow light that blend in with the original blue light to form sunlight-like white light. This would be the ideal source for general illumination (e.g., for indoor) or backlighting (e.g., for LCD).

  16. Promising new wavelengths for multi-photon microscopy: thinking outside the Ti:Sapphire box

    NASA Astrophysics Data System (ADS)

    Norris, Greg; Amor, Rumelo; Dempster, John; Amos, William B.; McConnell, Gail

    2013-02-01

    Multi-photon excitation (MPE) imaging is dominated by the Ti:Sapphire laser as the source for excitation. However, it is limited when considering 3PE of common fluorophores and efficient 2PE of UV dyes which require wavelengths beyond the range of the Ti:Sapphire. Two ultra-short pulsed sources are presented as alternatives: a novel optical parametric oscillator (OPO) geometry (1400-1600nm) and the sum-frequency mixing of an OPO and Yb-doped fibre laser, providing a tunable output (626-635nm). For long wavelengths, we report three-photon laser scanning microscopy (3PLSM) using a bi-directional pumped optical parametric oscillator (OPO) with signal wavelength output at 1500 nm. This novel laser was used to overcome the high optical loss in the infrared spectral region observed in laser scanning microscopes and objective lenses that renders them otherwise difficult to use for imaging. To test our system, we performed 3PLSM auto-fluorescence imaging of live plant cells at 1500 nm, specifically Spirogyra, and compared performance with two-photon excitation (2PLSM) imaging using a femtosecond pulsed Ti:Sapphire laser at 780 nm. Analysis of cell viability based on cytoplasmic organelle streaming and structural changes of cells revealed that at similar peak powers, 2PLSM caused gross cell damage after 5 minutes but 3PLSM showed little or no interference with cell function after 15 minutes. The 1500 nm OPO was thus shown to be a practical laser source for live cell imaging. For short wavelengths, we report the use of an all-solid-state ultra-short pulsed source specifically for two-photon microscopy at wavelengths shorter than those of the conventional Ti:Sapphire laser. Our approach involved sumfrequency mixing of the output from the long-wavelength OPO described above with residual pump radiation to generate fs-pulsed output in the red spectral region. We demonstrated the performance of our ultra-short pulsed system using fluorescently labelled and autofluorescent tissue

  17. Substrate compliance effects on buckle driven delamination in thin gold film systems.

    SciTech Connect

    Yeager, John.; Cordill, Megan J.; Adams, David Price; Moody, Neville Reid; Corona, Edmundo; Kennedy, Marian S.; Bahr, David F.; Reedy, Earl David, Jr.

    2010-10-01

    Film durability is a primary factor governing the use of emerging thin film flexible substrate devices where compressive stresses can lead to delamination and buckling. It is of particular concern in gold film systems found in many submicron and nanoscale applications. We are therefore studying these effects in gold on PMMA systems using compressively stressed tungsten overlayers to force interfacial failure and simulations employing cohesive zone elements to model the fracture process. Delamination and buckling occurred spontaneously following deposition with buckle morphologies that differed significantly from existing model predictions. Moreover, use of thin adhesive interlayers had no discernable effect on performance. In this presentation we will use observations and simulations to show how substrate compliance and yielding affects the susceptibility to buckling of gold films on compliant substrates. We will also compare the fracture energies and buckle morphologies of this study with those of gold films on sapphire substrates to show how changing substrate compliance affects buckle formation.

  18. Effects of substrate on the structure and orientation of ZnO thin film grown by rf-magnetron sputtering

    SciTech Connect

    Liu, H. F.; Chua, S. J.; Hu, G. X.; Gong, H.; Xiang, N.

    2007-10-15

    X-ray diffractions, Nomarski microscopy, scanning electron microscopy, and photoluminescence have been used to study the effects of substrate on the structure and orientation of ZnO thin films grown by rf-magnetron sputtering. GaAs(001), GaAs(111), Al{sub 2}O{sub 3}(0002) (c-plane), and Al{sub 2}O{sub 3}(1102) (r-plane) wafers have been selected as substrates in this study. X-ray diffractions reveal that the ZnO film grown on GaAs(001) substrate is purely textured with a high c-axis orientation while that grown on GaAs(111) substrate is a single ZnO(0002) crystal; a polycrystalline structure with a large-single-crystal area of ZnO(0002) is obtained on a c-plane Al{sub 2}O{sub 3} substrate while a ZnO(1120) single crystal is formed on an r-plane Al{sub 2}O{sub 3} substrate. There is absence of significant difference between the photoluminescence spectra collected from ZnO/GaAs(001), ZnO/GaAs(111), and ZnO/Al{sub 2}O{sub 3}(0002), while the photoluminescence from ZnO/Al{sub 2}O{sub 3}(1102) shows a reduced intensity together with an increased linewidth, which is, likely, due to the increased incorporation of native defects during the growth of ZnO(1120)

  19. Crystallographic Wet Chemical Etching of Semipolar GaN (11-22) Grown on m-Plane Sapphire Substrates.

    PubMed

    Kim, Jae-Kwan; Lee, Sung Nam; Song, Keun-Man; Yoon, Jae-Sik; Lee, Ji-Myon

    2015-07-01

    This paper reports the etch rates and etched surface morphology of semipolar GaN using a potassium hydroxide (KOH) solution. Semipolar (11-22) GaN could be etched easily using a KOH solution and the etch rate was higher than that of Ga-polar c-plane GaN (0001). The etch rate was anisotropic and the highest etch rate was measured to be approximately 116 nm/min for the (1011) plane and 62 nm/min for the (11-20) plane GaN using a 4 M KOH solution at 100 °C, resulting in specific surface features, such as inclined trigonal cells. PMID:26373117

  20. Crystallographic Wet Chemical Etching of Semipolar GaN (11-22) Grown on m-Plane Sapphire Substrates.

    PubMed

    Kim, Jae-Kwan; Lee, Sung Nam; Song, Keun-Man; Yoon, Jae-Sik; Lee, Ji-Myon

    2015-07-01

    This paper reports the etch rates and etched surface morphology of semipolar GaN using a potassium hydroxide (KOH) solution. Semipolar (11-22) GaN could be etched easily using a KOH solution and the etch rate was higher than that of Ga-polar c-plane GaN (0001). The etch rate was anisotropic and the highest etch rate was measured to be approximately 116 nm/min for the (1011) plane and 62 nm/min for the (11-20) plane GaN using a 4 M KOH solution at 100 °C, resulting in specific surface features, such as inclined trigonal cells.

  1. Power electronics substrate for direct substrate cooling

    DOEpatents

    Le, Khiet; Ward, Terence G.; Mann, Brooks S.; Yankoski, Edward P.; Smith, Gregory S.

    2012-05-01

    Systems and apparatus are provided for power electronics substrates adapted for direct substrate cooling. A power electronics substrate comprises a first surface configured to have electrical circuitry disposed thereon, a second surface, and a plurality of physical features on the second surface. The physical features are configured to promote a turbulent boundary layer in a coolant impinged upon the second surface.

  2. Effect of layers of carbon-nanotube-patterned substrate on GaN-based light-emitting diodes

    NASA Astrophysics Data System (ADS)

    Shan, Liang; Wei, Tongbo; Sun, Yuanping; Zhang, Yonghui; Xiong, Zhuo; Zhen, Aigong; Wang, Junxi; Wei, Yang; Li, Jinmin

    2015-06-01

    In this paper, the high-performance GaN-based light-emitting diodes (LEDs) with coated carbon nanotubes (CNTs) on sapphire substrates, fabricated by metal-organic chemical vapor deposition (MOCVD), were demonstrated. The different layers of a CNT-patterned sapphire substrate (CNPSS) grown by an optimized growth process were discussed. Results of X-ray diffraction (XRD) showed the threading dislocations to be suppressed, thus the crystal quality of the GaN film was improved by introducing the carbon nanotube films. The LEDs with a CNPSS exhibited lower reverse-bias current and divergent angle, and larger enhancement of the light output power (LOP) compared with the conventional LEDs. With the increase in the number of layers of CNTs, the CNPSS-LED exhibited better crystal quality and photoelectric property, but more layers of CNTs also absorbed more light. There is a trade-off between the crystalline quality of the LED and light absorption.

  3. Fast-switching system for injection seeding of a high-power Ti:sapphire laser.

    PubMed

    Khalesifard, Hamid R; Fix, Andreas; Ehret, Gerhard; Schiller, Max; Wulfmeyer, Volker

    2009-07-01

    A high frequency switching and tunable seed laser system has been designed and constructed for injection seeding of a high-power pulsed Ti:sapphire laser. The whole laser system operates as the transmitter of a scanning, ground-based, water-vapor differential absorption lidar (DIAL). The output of two seed lasers can be tuned in the wavelength range of 815-840 nm up to the power of 20 mW and switched between the online and offline wavelengths of the DIAL at frequencies of 0-1 kHz. The frequency stability of online and offline seed lasers is better than +/-20 MHz rms and the mode-hop-free tuning range is greater than 40 GHz with external cavity diode lasers. The advantage of this system for efficient injection seeding of the Ti:sapphire cavity is that it is modular, robust, fully fiber-coupled, and polarization maintaining.

  4. Oscillatory Mass Transport in Vapor-Liquid-Solid Growth of Sapphire Nanowires

    SciTech Connect

    Oh, Sang Ho; Chisholm, Matthew F; Kauffmann, Yaron; Kaplan, Prof. Wayne D.; Luo, Weidong; Ruhle, M.; Scheu, Christina

    2010-01-01

    In vapor-liquid-solid (VLS) growth, the liquid phase plays a pivotal role in mediating mass transport from the vapor source to the growth front of a nanowire. Such transport often takes place through the liquid phase. However, we observed by in situ transmission electron microscopy a different behavior for self-catalytic VLS growth of sapphire nanowires. The growth occurs in a layer-by-layer fashion and is accomplished by interfacial diffusion of oxygen through the ordered liquid aluminum atoms. Oscillatory growth and dissolution reactions at the top rim of the nanowires occur and supply the oxygen required to grow a new (0006) sapphire layer. A periodic modulation of the VLS triple-junction configuration accompanies these oscillatory reactions.

  5. Bend Properties of Sapphire Fibers at Elevated Temperatures. 1; Bend Survivability

    NASA Technical Reports Server (NTRS)

    Morscher, Gregory N.; Sayir, Haluk

    1995-01-01

    The effect of temperature on the bend radius that a c-axis-oriented sapphire fiber can withstand was determined for fibers of various diameter. Bend stress rupture tests were performed for times of 1-100 h and temperatures of 300-1700 C. Fibers would survive the bend test undeformed, would fracture or would deform. The bend survival radius was determined to be the radius above which no fibers fractured or deformed for a given time-temperature treatment. It was found that the ability of fibers to withstand curvature decreases substantially with time and increasing temperature and that fibers of smaller diameter (46-83 micron) withstood smaller bend radii than would be expected from just a difference in fiber diameter when compared with the bend results of the fibers of large diameter (144 micron). This was probably due to different flaw populations, causing high temperature bend failure for the tested sapphire fibers of different diameters.

  6. Interfacial thermal resistance between high-density polyethylene (HDPE) and sapphire

    NASA Astrophysics Data System (ADS)

    Zheng, Kun; Zhu, Jie; Ma, Yong-Mei; Tang, Da-Wei; Wang, Fo-Song

    2014-10-01

    To improve the thermal conductivity of polymeric composites, the numerous interfacial thermal resistance (ITR) inside is usually considered as a bottle neck, but the direct measurement of the ITR is hardly reported. In this paper, a sandwich structure which consists of transducer/high density polyethylene (HDPE)/sapphire is prepared to study the interface characteristics. Then, the ITRs between HDPE and sapphire of two samples with different HDPE thickness values are measured by time-domain thermoreflectance (TDTR) method and the results are ~ 2 × 10-7 m2·K·W-1. Furthermore, a model is used to evaluate the importance of ITR for the thermal conductivity of composites. The model's analysis indicates that reducing the ITR is an effective way of improving the thermal conductivity of composites. These results will provide valuable guidance for the design and manufacture of polymer-based thermally conductive materials.

  7. Design and analysis of large-core single-mode windmill single crystal sapphire optical fiber

    DOE PAGES

    Cheng, Yujie; Hill, Cary; Liu, Bo; Yu, Zhihao; Xuan, Haifeng; Homa, Daniel; Wang, Anbo; Pickrell, Gary

    2016-06-01

    We present a large-core single-mode “windmill” single crystal sapphire optical fiber (SCSF) design, which exhibits single-mode operation by stripping off the higher-order modes (HOMs) while maintaining the fundamental mode. The “windmill” SCSF design was analyzed using the finite element analysis method, in which all the HOMs are leaky. The numerical simulation results show single-mode operation in the spectral range from 0.4 to 2 μm in the windmill SCSF, with an effective core diameter as large as 14 μm. Such fiber is expected to improve the performance of many of the current sapphire fiber optic sensor structures.

  8. Determination of Second-Order Nonlinear Optical Susceptibility of GaN Films on Sapphire

    NASA Astrophysics Data System (ADS)

    Fujita, Takashi; Hasegawa, Tatsuo; Haraguchi, Masanobu; Okamoto, Toshihiro; Fukui, Masuo; Nakamura, Syuji

    2000-05-01

    The second-order nonlinear susceptibilities of GaN films on sapphire were determined by the Maker fringe technique. In deriving the second-harmonic intensity, the bound wave propagating from the GaN-air interface to the GaN-sapphire interface and that propagating in the opposite direction were taken into account. We obtained |χ(2)zxx|=14.7±0.2 pm/V, |χ(2)xzx|=14.4±0.2 pm/V and |χ(2)zzz|=29.7±0.7 pm/V for the GaN film with a thickness of 2.55 μm using fundamental light with a wavelength of 1.064 μm.

  9. High-Temperature Mechanical Properties of Cr(3+) Doped Sapphire Fibers

    NASA Technical Reports Server (NTRS)

    Sayir, A.; QuispeCancapa, J. J.; deArellanoLopez, A. R.; Gray, Hugh R. (Technical Monitor)

    2002-01-01

    High-temperature slow-crack growth of single crystal 10 wt% Cr2O3 - Al2O3 (nominal composition) fibers has been studied by tensile rupture experiments at 1400 C, under different stressing rates (0.5 to 41.5 MPa/s). Slow-crack growth (SCG) is less pronounced with increasing Cr2O3. Rupture stresses increased with the stressing rate from 397 MPa to 515 MPa, resulting in a SCG exponent, N=19. The Cr2O3 composition was analyzed by Energy Dispersed X-Ray Spectra (EDS) and fracture surfaces were studied by scanning electron microscopy (SEM). Results are compared with previous studies on 100-300 ppm Cr3(+) doped sapphire fibers and on commercial sapphire fibers.

  10. Fast-switching system for injection seeding of a high-power Ti:sapphire laser.

    PubMed

    Khalesifard, Hamid R; Fix, Andreas; Ehret, Gerhard; Schiller, Max; Wulfmeyer, Volker

    2009-07-01

    A high frequency switching and tunable seed laser system has been designed and constructed for injection seeding of a high-power pulsed Ti:sapphire laser. The whole laser system operates as the transmitter of a scanning, ground-based, water-vapor differential absorption lidar (DIAL). The output of two seed lasers can be tuned in the wavelength range of 815-840 nm up to the power of 20 mW and switched between the online and offline wavelengths of the DIAL at frequencies of 0-1 kHz. The frequency stability of online and offline seed lasers is better than +/-20 MHz rms and the mode-hop-free tuning range is greater than 40 GHz with external cavity diode lasers. The advantage of this system for efficient injection seeding of the Ti:sapphire cavity is that it is modular, robust, fully fiber-coupled, and polarization maintaining. PMID:19655946

  11. 100-kHz 22-fs Ti:sapphire regenerative amplification laser with programmable spectral control

    NASA Astrophysics Data System (ADS)

    Sung, Jae Hee; Lee, Hwang Woon; Nam, Chang Hee; Lee, Seong Ku

    2016-05-01

    An ultrashort, high-power Ti:sapphire laser operating at 100 kHz was developed. A regenerative amplifier with a cryogenically cooled Ti:sapphire crystal and a grism compressor were incorporated in the laser. For achieving a wide bandwidth of 78 nm, a programmable spectral control filter was applied to the regenerative amplifier to compensate for the gain narrowing effect. An output power of 1.4 GW with near Fourier-transform-limited pulse duration of 22 fs was achieved after minimizing a spectral phase error with the grism compressor, and the measured beam quality factor ( M 2) was less than 1.2. This high-quality laser will facilitate applications requiring high-repetition rate, ultrashort, high-power laser pulses.

  12. System design and relaxation oscillations of a titanium-sapphire laser. Master thesis

    SciTech Connect

    Erikson, W.L.

    1992-08-01

    A general method for designing a laser system is presented. Using the Ti:sapphire laser as an example, the requirements of stability, astigmatic compensation, and matching of the pump and cavity modes are addressed. Investigations into the relaxation oscillations of a Ti-sapphire laser are reported. Using four level laser rate equation theory, a technique is developed for analyzing relaxation oscillations exhibited by a laser. This technique presents a new and simple method for measuring the upper state lifetime and intrinsic cavity losses of a laser system. Beam-like vector solutions to Maxwell's equations are also presented. These solutions present a more detailed description of the polarization properties of laser beams. Experimental evidence of these properties is shown using an Argon laser.

  13. Use of Be(p,{alpha}) and Be(p,d) Reactions to Determine Be Content in Sapphire

    SciTech Connect

    Franklyn, C. B.

    2011-12-13

    Since natural coloured sapphire ({alpha}-Al{sub 2}O{sub 3}) commands a high gem stone market price there is a need for a reliable method of identifying artificially coloured sapphire that has an inherently lower value. Diffusing beryllium into sapphire at high temperatures results in a coloured stone virtually indistinguishable from a natural one. Beryllium can occur naturally in sapphire but at levels of <1 ppma. Beryllium diffused sapphire typically contains >10 ppma, which is difficult to determine in a non destructive way. It is possible to utilize nuclear reaction analysis techniques to determine the beryllium content in a macroscopically non destructive way. Kinematically ideal reactions are Be(p,{alpha}) and Be(p,d) which, for Ep = 0.5 to 0.9 MeV, exhibit distinct reaction product signatures well separated from other proton induced reactions in aluminium or oxygen. Due to the lack of comprehensive cross section data for the Be(p,{alpha}) and Be(p,d) reactions in the energy range of interest, a series of measurements were made at the Van de Graaff accelerator facility at Necsa to create a new data base. A further outcome of these measurements was a deviation in reported values for the non-Rutherfordian proton back-scatter cross section. These new data bases, which extend to Ep = 2.6MeV, can now facilitate a procedure for determining beryllium content in sapphire.

  14. Surface-induced anisotropic orientations of interfacial ethanol molecules at air/sapphire (1-102) and ethanol/sapphire (1-102) interfaces

    SciTech Connect

    Sung, J.; Waychunas, G. A.; Shen, Y. R.

    2011-06-01

    Sum frequency vibrational spectroscopy was used to study the interfacial arrangement of ethanol molecules at the vapor/α-Al{sub 2}O{sub 3} (1{bar 1}02 ) and α-Al{sub 2}O{sub 3} (1{bar 1}02 )/ethanol liquid interfaces. The spectra in the C-H range show that ethanol molecules adsorbed from vapor onto α-Al{sub 2}O{sub 3} (1{bar 1}02 ) surface have a welldefined anisotropic arrangement following the structure of the α-Al{sub 2}O{sub 3} (1{bar 1}02 ) surface. The arrangement can be explained by the formation of two specific hydrogen bonds between the adsorbed ethanol molecule and hydroxyls on the sapphire surface. At the α-Al{sub 2}O{sub 3} (1{bar 1}02 )/ethanol liquid interface, the first ethanol monolayer assumes a similar anisotropic arrangement as in the case of an ethanol monolayer on the dry sapphire surface. The second monolayer has a rather broad orientation distribution that is azimuthally nearly isotropic, but with molecules flipped 180 degrees with respect to those in the first monolayer.

  15. A Ti:Sapphire laser for the new polarized electron source

    SciTech Connect

    Frisch, J.; Woods, M.B.; Zolotorev, M.

    1992-10-01

    The SLAC polarized electron source uses a laser driven photo cathode gun. We have developed a Titanium Sapphire laser at SLAC to replace the dye laser currently used for the source. The new laser is designed to operate at wavelengths between 750 and 850 nm while producing 400mJ of energy in 1.6 ns pulses at 120 Hz. Installation on the accelerator is expected in January of 1993.

  16. Self-seeding of a pulsed double-grating Ti:sapphire laser oscillator.

    PubMed

    Tamura, Koji

    2008-04-01

    A self-seeded pulsed double-grating Ti:sapphire laser oscillator consisting of a grazing incidence cavity geometry with a pair of gratings and a standing-wave cavity pumped by a frequency-doubled Nd:YAG laser was developed and characterized. With self-seeding, narrow-linewidth single-longitudinal-mode (SLM) operation and SLM scanning were possible with a reduced lasing threshold, which was desirable for the intended applications.

  17. Single-longitudinal-mode scan of a pulsed double-grating Ti:sapphire oscillator.

    PubMed

    Tamura, Koji

    2007-08-10

    The method of the single-longitudinal-mode (SLM) scan of a pulsed double-grating Ti:sapphire laser oscillator with the grazing incidence cavity configuration was proposed based on the analysis of the optical path length. The SLM scan was experimentally confirmed for this cavity configuration, where the second grating was rotated around an arbitrary point with the translational scan of a back mirror.

  18. Sub-100 fs high average power directly blue-diode-laser-pumped Ti:sapphire oscillator

    NASA Astrophysics Data System (ADS)

    Rohrbacher, Andreas; Markovic, Vesna; Pallmann, Wolfgang; Resan, Bojan

    2016-03-01

    Ti:sapphire oscillators are a proven technology to generate sub-100 fs (even sub-10 fs) pulses in the near infrared and are widely used in many high impact scientific fields. However, the need for a bulky, expensive and complex pump source, typically a frequency-doubled multi-watt neodymium or optically pumped semiconductor laser, represents the main obstacle to more widespread use. The recent development of blue diodes emitting over 1 W has opened up the possibility of directly diode-laser-pumped Ti:sapphire oscillators. Beside the lower cost and footprint, a direct diode pumping provides better reliability, higher efficiency and better pointing stability to name a few. The challenges that it poses are lower absorption of Ti:sapphire at available diode wavelengths and lower brightness compared to typical green pump lasers. For practical applications such as bio-medicine and nano-structuring, output powers in excess of 100 mW and sub-100 fs pulses are required. In this paper, we demonstrate a high average power directly blue-diode-laser-pumped Ti:sapphire oscillator without active cooling. The SESAM modelocking ensures reliable self-starting and robust operation. We will present two configurations emitting 460 mW in 82 fs pulses and 350 mW in 65 fs pulses, both operating at 92 MHz. The maximum obtained pulse energy reaches 5 nJ. A double-sided pumping scheme with two high power blue diode lasers was used for the output power scaling. The cavity design and the experimental results will be discussed in more details.

  19. Self-seeding of a pulsed double-grating Ti:sapphire laser oscillator

    SciTech Connect

    Tamura, Koji

    2008-04-01

    A self-seeded pulsed double-grating Ti:sapphire laser oscillator consisting of a grazing incidence cavity geometry with a pair of gratings and a standing-wave cavity pumped by a frequency-doubled Nd:YAG laser was developed and characterized. With self-seeding, narrow-linewidth single-longitudinal-mode (SLM) operation and SLM scanning were possible with a reduced lasing threshold, which was desirable for the intended applications.

  20. Modeling habit forms of sapphire crystals using the principles of periodic-bond-chain method

    NASA Astrophysics Data System (ADS)

    Bakholdin, S. I.; Maslov, V. N.

    2015-03-01

    The potential of the periodic-bond-chain method for calculating the sequence of manifestation of faces of corundum single crystals is considered. The leading role of the faces of the pinacoid, high rhombohedron, and hexagonal prism is demonstrated. The calculation results are compared with the experimental data on faceting the lateral surface of cylindrical sapphire single crystals grown by the Stepanov method and with the faceting data for crystals grown by the flux method and natural crystals.

  1. Giant secondary grain growth in Cu films on sapphire

    SciTech Connect

    Miller, David L.; Keller, Mark W.; Shaw, Justin M.; Rice, Katherine P.; Keller, Robert R.; Diederichsen, Kyle M.

    2013-08-15

    Single crystal metal films on insulating substrates are attractive for microelectronics and other applications, but they are difficult to achieve on macroscopic length scales. The conventional approach to obtaining such films is epitaxial growth at high temperature using slow deposition in ultrahigh vacuum conditions. Here we describe a different approach that is both simpler to implement and produces superior results: sputter deposition at modest temperatures followed by annealing to induce secondary grain growth. We show that polycrystalline as-deposited Cu on α-Al{sub 2}O{sub 3}(0001) can be transformed into Cu(111) with centimeter-sized grains. Employing optical microscopy, x-ray diffraction, and electron backscatter diffraction to characterize the films before and after annealing, we find a particular as-deposited grain structure that promotes the growth of giant grains upon annealing. To demonstrate one potential application of such films, we grow graphene by chemical vapor deposition on wafers of annealed Cu and obtain epitaxial graphene grains of 0.2 mm diameter.

  2. A Voltage Controlled Oscillator for a Phase-Locked Loop Frequency Synthesizer in a Silicon-on-Sapphire Process

    SciTech Connect

    Garrison, Sean

    2009-05-21

    Engineers from a government-owned engineering and manufacturing facility were contracted by government-owned research laboratory to design and build an S-band telemetry transmitter using Radio Frequency Integrated Circuit (RFIC) technology packaged in a Low-Temperature Co-fired Ceramic (LTCC) Multi-Chip Module. The integrated circuit technology chosen for the Phase-Locked Loop Frequency Synthesizer portion of the telemetry transmitter was a 0.25 um CMOS process that utilizes a sapphire substrate and is fabricated by Peregrine Semiconductor corporation. This thesis work details the design of the Voltage Controlled Oscillator (VCO) portion of the PLL frequency synthesizer and constitutes an fully integrated VCO core circuit and a high-isolation buffer amplifier. The high-isolation buffer amplifier was designed to provide 16 dB of gain for 2200-3495 MHz as well as 60 dB of isolation for the oscillator core to provide immunity to frequency pulling due to RF load mismatch. Actual measurements of the amplifier gain and isolation showed the gain was approximately 5 dB lower than the simulated gain when all bond-wire and test substrate parasitics were taken into account. The isolation measurements were shown to be 28 dB at the high end of the frequency band but the measurement was more than likely compromised due to the aforementioned bond-wire and test substrate parasitics. The S-band oscillator discussed in this work was designed to operate over a frequency range of 2200 to 2300 MHz with a minimum output power of 0 dBm with a phase-noise of -92 dBc/Hz at a 100 kHz offset from the carrier. The tuning range was measured to be from 2215 MHz to 2330 MHz with a minimum output power of -7 dBm over the measured frequency range. A phase-noise of -90 dBc was measured at a 100 kHz offset from the carrier.

  3. Bonding Lexan and sapphire to form high-pressure, flame-resistant window

    NASA Technical Reports Server (NTRS)

    Richardson, William R.; Walker, Ernie D.

    1987-01-01

    Flammable materials have been studied in normal gravity and microgravity for many years. Photography plays a major role in the study of the combustion process giving a permanent visual record that can be analyzed. When these studies are extended to manned spacecraft, safety becomes a primary concern. The need for a high-pressure, flame-resistant, shatter-resistant window permitting photographic recording of combustion experiments in manned spacecraft prompted the development of a method for bonding Lexan and sapphire. Materials that resist shattering (e.g., Lexan) are not compatible with combustion experiments; the material loses strength at combustion temperatures. Sapphire is compatible with combustion temperatures in oxygen-enriched atmospheres but is subject to shattering. Combining the two materials results in a shatter-resistant, flame-resistant window. Combustion in microgravity produces a low-visibility flame; however, flame propagation and flame characteristics are readily visible as long as there is no deterioration of the image. Since an air gap between the Lexan and the sapphire would reduce transmission, a method was developed for bonding these unlike materials to minimize light loss.

  4. Tuning the Interfacial Thermal Conductance between Polystyrene and Sapphire by Controlling the Interfacial Adhesion.

    PubMed

    Zheng, Kun; Sun, Fangyuan; Tian, Xia; Zhu, Jie; Ma, Yongmei; Tang, Dawei; Wang, Fosong

    2015-10-28

    In polymer-based electric microdevices, thermal transport across polymer/ceramic interface is essential for heat dissipation, which limits the improvement of the device performance and lifetime. In this work, four sets of polystyrene (PS) thin films/sapphire samples were prepared with different interface adhesion values, which was achieved by changing the rotation speeds in the spin-coating process. The interfacial thermal conductance (ITC) between the PS films and the sapphire were measured by time domain thermoreflectance method, and the interfacial adhesion between the PS films and the sapphire, as measured by a scratch tester, was found to increase with the rotation speed from 2000 to 8000 rpm. The ITC shows a similar dependence on the rotation speed, increasing up to a 3-fold from 7.0 ± 1.4 to 21.0 ± 4.2 MW/(m(2) K). This study demonstrates the role of spin-coating rotation speed in thermal transport across the polymer/ceramic interfaces, evoking a much simpler mechanical method for tuning this type of ITC. The findings of enhancement of the ITC of polymer/ceramic interface can shed some light on the thermal management and reliability of macro- and microelectronics, where polymeric and hybrid organic-inorganic nano films are employed.

  5. High-harmonic generation by field enhanced femtosecond pulses in metal-sapphire nanostructure

    PubMed Central

    Han, Seunghwoi; Kim, Hyunwoong; Kim, Yong Woo; Kim, Young-Jin; Kim, Seungchul; Park, In-Yong; Kim, Seung-Woo

    2016-01-01

    Plasmonic high-harmonic generation (HHG) drew attention as a means of producing coherent extreme ultraviolet (EUV) radiation by taking advantage of field enhancement occurring in metallic nanostructures. Here a metal-sapphire nanostructure is devised to provide a solid tip as the HHG emitter, replacing commonly used gaseous atoms. The fabricated solid tip is made of monocrystalline sapphire surrounded by a gold thin-film layer, and intended to produce EUV harmonics by the inter- and intra-band oscillations of electrons driven by the incident laser. The metal-sapphire nanostructure enhances the incident laser field by means of surface plasmon polaritons, triggering HHG directly from moderate femtosecond pulses of ∼0.1 TW cm−2 intensities. The measured EUV spectra exhibit odd-order harmonics up to ∼60 nm wavelengths without the plasma atomic lines typically seen when using gaseous atoms as the HHG emitter. This experimental outcome confirms that the plasmonic HHG approach is a promising way to realize coherent EUV sources for nano-scale near-field applications in spectroscopy, microscopy, lithography and atto-second physics. PMID:27721374

  6. Study of discharge after electron irradiation in sapphires and polycrystalline alumina

    SciTech Connect

    Zarbout, K.; Moya, G.; Ahmed, A. Si; Damamme, G.; Kallel, A.

    2010-11-15

    The fraction R of charges undergoing discharge during the time separating two electron pulses is derived from the induced current method developed in a scanning electron microscope. Irradiation is performed via a 10 keV defocused electron beam and low current density. The evolution of R with temperature (in the range 300-663 K) obeys to an Arrhenius type relation. Activation energies connected with the processes involved are deduced. In sapphire, no discernible discharge is observed due to the dominance of deep traps. In silver doped sapphire, R increases sharply from 10% to 70% as the temperature rises from 360 to 420 K, with a corresponding activation energy of 0.51 eV. In contrast, in polycrystalline alumina processed by solid state sintering (grain diameters of 1.7, 2.7, and 4.5 {mu}m) the degree of discharge increases continuously with temperature and grain size. The enhancement with grain size indicates that the sintering conditions influence strongly the efficiency of a gettering effect. The activation energy below 573 K is about 0.12 eV independently of grain size. Above 573 K, a second activation energy of 0.26 eV appears for the smallest grain size sample. The results suggest that discharge may stem from a density of trapping states, associated to grain boundaries in sintered samples, rather than from a single trapping level linked to the doping element as Ag in sapphire.

  7. Study of sapphire probe tip wear when scanning on different materials

    NASA Astrophysics Data System (ADS)

    Nicolet, Anaïs; Küng, Alain; Meli, Felix

    2012-09-01

    The accuracy of today's coordinate measuring machines (CMM) has reached a level at which exact knowledge of each component is required. The role of the probe tip is particularly crucial as it is in contact with the sample surface. Understanding how the probe tip wears off will help to narrow the measurement errors. In this work, wear of a sapphire sphere was studied for different scanning conditions and with different sample materials. Wear depth on the probe was investigated using an automated process in situ on the METAS micro-CMM and completed by measurements with an atomic force microscope. We often found a linear dependence between the wear depth and the scan length ranging from 0.5 to 9 nm m-1, due to variations in scan speed, contact force or sample material. In the case of steel, the wear rate is proportional to the scan speed, while for aluminum several processes seem to interact. A large amount of debris was visible after the tests. Except for aluminum, wear was visible only on the sphere and not on the sample. Sapphire/steel is the worst combination in terms of wear, whereas the combination sapphire/ceramic exhibits almost no wear.

  8. High-harmonic generation by field enhanced femtosecond pulses in metal-sapphire nanostructure

    NASA Astrophysics Data System (ADS)

    Han, Seunghwoi; Kim, Hyunwoong; Kim, Yong Woo; Kim, Young-Jin; Kim, Seungchul; Park, In-Yong; Kim, Seung-Woo

    2016-10-01

    Plasmonic high-harmonic generation (HHG) drew attention as a means of producing coherent extreme ultraviolet (EUV) radiation by taking advantage of field enhancement occurring in metallic nanostructures. Here a metal-sapphire nanostructure is devised to provide a solid tip as the HHG emitter, replacing commonly used gaseous atoms. The fabricated solid tip is made of monocrystalline sapphire surrounded by a gold thin-film layer, and intended to produce EUV harmonics by the inter- and intra-band oscillations of electrons driven by the incident laser. The metal-sapphire nanostructure enhances the incident laser field by means of surface plasmon polaritons, triggering HHG directly from moderate femtosecond pulses of ~0.1 TW cm-2 intensities. The measured EUV spectra exhibit odd-order harmonics up to ~60 nm wavelengths without the plasma atomic lines typically seen when using gaseous atoms as the HHG emitter. This experimental outcome confirms that the plasmonic HHG approach is a promising way to realize coherent EUV sources for nano-scale near-field applications in spectroscopy, microscopy, lithography and atto-second physics.

  9. NpN-GaN/InxGa1-xN/GaN heterojunction bipolar transistor on free-standing GaN substrate

    NASA Astrophysics Data System (ADS)

    Lochner, Zachary; Jin Kim, Hee; Lee, Yi-Che; Zhang, Yun; Choi, Suk; Shen, Shyh-Chiang; Doug Yoder, P.; Ryou, Jae-Hyun; Dupuis, Russell D.

    2011-11-01

    Data and analysis are presented for NpN-GaN/InGaN/GaN double-heterojunction bipolar transistors (HBTs) grown and fabricated on a free-standing GaN (FS-GaN) substrate in comparison to that on a sapphire substrate to investigate the effect of dislocations in III-nitride HBT epitaxial structures. The performance characteristics of HBTs on FS-GaN exhibit a maximum collector current density of ˜12.3 kA/cm2, dc current gain of ˜90, and maximum differential gain of ˜120 without surface passivation, representing a substantial improvement over similar devices grown on sapphire. This is attributed to the reduction in threading dislocation density afforded by using a homoepitaxial growth on a high-crystalline-quality substrate. The minority carrier diffusion length increases significantly owing to not only a mitigated carrier trap effect via fewer dislocations, but also possibly reduced microscopic localized states.

  10. Impact of thermal stress on the piezoelectric and dielectric properties of PbTiO{sub 3} thick films on various substrates

    SciTech Connect

    Bai, Gang; Liu, Zhiguo; Yan, Xiaobing; Zhang, Changchun

    2014-08-07

    The impact of thermal stress on the polarization, as well as dielectric and piezoelectric properties of (001) oriented PbTiO{sub 3} (PTO) thick films deposited on various substrates was investigated based on Landau-Devonshire thermodynamic model. The results showed that dielectric and piezoelectric properties of PTO films depend strongly on the thermal stress in PTO films decided by the deposition temperature T{sub G} and the thermal expansion coefficients' difference between PTO films and substrates. For IC-compatible substrates such as Si, c-sapphire, and a-sapphire that induce tensile in-plane thermal stresses, the dielectric and piezoelectric responses and tunabilities of PTO films were enhanced. Whereas for PTO films on MgO, compressive thermal in-plane stresses can degraded the dielectric and piezoelectric responses and tunabilities of the films.

  11. Laser damage resistant anti-reflection microstructures in Raytheon ceramic YAG, sapphire, ALON, and quartz

    NASA Astrophysics Data System (ADS)

    Hobbs, Douglas S.; MacLeod, Bruce D.; Sabatino, Ernest, III; Hartnett, Thomas M.; Gentilman, Richard L.

    2011-06-01

    A study of the laser induced damage threshold (LiDT) of anti-reflection (AR) microstructures (ARMs) built in the end facets of metal ion doped yttrium aluminum garnet (YAG) laser gain material, has been conducted. Test samples of undoped and ytterbium-doped polycrystalline YAG produced by Raytheon Company were processed with ARMs in one surface and subjected to standardized pulsed LiDT testing at the near-infrared (NIR) wavelength of 1064nm. As received YAG samples with a simple commercial polish were also submitted to the damage tests for comparison, along with YAG samples that were treated with a single layer thin-film AR coating designed for maximum transmission at 1064nm. Additional samples of single crystal sapphire and quartz, and polycrystalline ALONTM windows were prepared with thin-film AR coatings and ARMs textures to expand the 1064nm laser damage testing to other important NIR transmitting materials. It was found that the pulsed laser damage resistance of ARMs textured ceramic YAG windows is 11 J/cm2, a value that is 43% higher than untreated ceramic YAG windows, suggesting that ARMs fabrication removed residual sub-surface damage, a factor that has been shown to be important for increasing the damage resistance of an optic. This conclusion is also supported by the high damage threshold values found with the single layer AR coatings on ceramic YAG where the coatings may have shielded the sub-surface polishing damage. Testing results for the highly polished sapphire windows also support the notion that better surface preparation produces higher damage resistance. The damage threshold for untreated sapphire windows exceeded 32 J/cm2 for one sample with an average of 27.5 J/cm2 for the two samples tested. The ARMs-treated sapphire windows had similar damage thresholds as the untreated material, averaging 24.9 J/cm2, a value 1.5 to 2 times higher than the damage threshold of the thin film AR coated sapphire windows.

  12. Wave Propagation Direction and c-Axis Tilt Angle Influence on the Performance of ScAlN/Sapphire-Based SAW Devices.

    PubMed

    Kochhar, Abhay; Yamamoto, Yasuo; Teshigahara, Akihiko; Hashimoto, Ken-Ya; Tanaka, Shuji; Esashi, Masayoshi

    2016-07-01

    Some previously reported surface acoustic wave (SAW) devices using bulk piezoelectric substrates showed higher acoustic power radiated in either forward or backward wave propagation direction depending on their crystal orientations and are called natural single-phase unidirectional transducers (NSPUDT). While these reports were based on bulk piezoelectric substrates, we report directionality in the c-axis tilted 44% scandium doped aluminum nitride thin piezoelectric film-based SAW devices on sapphire. It is worth noting that our observance of directionality is specifically in Sezawa mode. We produced a c-axis tilt up to 5.5° over the single wafer and examined the directionality by comparing the forward and backward insertion loss utilizing split finger electrodes as a receiver. The wave propagation direction and c-axis tilt angle influence on the performance of SAW devices is evaluated. Furthermore, return loss and insertion loss data are presented for various SAW propagation directions and c-axis tilt angles. Finally, the comparison for both acoustic modes, i.e., Rayleigh and Sezawa, is reported. PMID:26978772

  13. Electron beam evaporation induced discoloration of reflective film on InGaN/sapphire in III-V LED TFFC device manufacturing

    NASA Astrophysics Data System (ADS)

    Neelakandan, Sivanantham; Chai, Chun Hoo; Chaw, Kam Hoe; Sae Tae, Veera

    2015-07-01

    In this paper, the discoloration of indium-gallium-nitride (InGaN) on sapphire (Al2O3) substrate after processing in electron beam vacuum evaporation for mirror metal evaporation has been investigated. Discoloration can be detrimental to light output of a light emitting diode (LED) as the light extraction through discolored gallium nitride (GaN) epitaxy is impacted. The investigation shows that the discoloration caused by an interaction between few factors such as the level of organic contamination present at the edges of the substrate, contact area with holding dome of the evaporator, thickness of the film deposited and radiation intensity from the evaporation source. Reflection Spectroscopy was used to quantify reflectivity of discolored mirror metal while X-ray fluorescence spectrometry (XRF) was used to measure film thickness and time of flight - secondary ion mass spectrometry (TOF-SIMS) was employed to measure organic contamination amounts. A residual gas analyzing (RGA) technique was established to detect potential discoloration to eliminate disruptions to manufacturing.

  14. Enhanced performances of diode-pumped sapphire/Er³⁺:Yb³⁺:LuAl₃(BO₃)₄/sapphire micro-laser at 1.5-1.6 μm.

    PubMed

    Chen, Yujin; Lin, Yanfu; Huang, Jianhua; Gong, Xinghong; Luo, Zundu; Huang, Yidong

    2015-05-01

    A sandwich-type sapphire/Er3+:Yb3+:LuAl3(BO3)4/sapphire micro-laser was fabricated by tightly pressing two sapphire crystals and a Er3+:Yb3+:LuAl3(BO3)4 microchip together, and directly depositing cavity mirrors onto the outside surfaces of the sapphire crystals. Pumped by a continuous-wave 976 nm diode laser, a 1543 nm laser with maximum output power of 1.17 W and slope efficiency of 33% with respect to incident pump power was realized in the sandwich-type micro-laser, whereas a laser with maximum output power of 0.46 W and slope efficiency of 17% was obtained in a monolithic Er3+:Yb3+:LuAl3(BO3)4 micro-laser. Furthermore, efficient 1521 nm continuous-wave and passively Q-switched pulse lasers were also demonstrated in the sandwich-type micro-laser.

  15. Enhanced performances of diode-pumped sapphire/Er³⁺:Yb³⁺:LuAl₃(BO₃)₄/sapphire micro-laser at 1.5-1.6 μm.

    PubMed

    Chen, Yujin; Lin, Yanfu; Huang, Jianhua; Gong, Xinghong; Luo, Zundu; Huang, Yidong

    2015-05-01

    A sandwich-type sapphire/Er3+:Yb3+:LuAl3(BO3)4/sapphire micro-laser was fabricated by tightly pressing two sapphire crystals and a Er3+:Yb3+:LuAl3(BO3)4 microchip together, and directly depositing cavity mirrors onto the outside surfaces of the sapphire crystals. Pumped by a continuous-wave 976 nm diode laser, a 1543 nm laser with maximum output power of 1.17 W and slope efficiency of 33% with respect to incident pump power was realized in the sandwich-type micro-laser, whereas a laser with maximum output power of 0.46 W and slope efficiency of 17% was obtained in a monolithic Er3+:Yb3+:LuAl3(BO3)4 micro-laser. Furthermore, efficient 1521 nm continuous-wave and passively Q-switched pulse lasers were also demonstrated in the sandwich-type micro-laser. PMID:25969325

  16. High-breakdown-voltage pn-junction diodes on GaN substrates

    NASA Astrophysics Data System (ADS)

    Yoshizumi, Yusuke; Hashimoto, Shin; Tanabe, Tatsuya; Kiyama, Makoto

    2007-01-01

    GaN pn-junction diodes have been grown on GaN and sapphire substrates by metalorganic vapor phase epitaxy and their electrical characteristics have been studied. For the diode on the GaN substrate, the reverse leakage current is lower and the breakdown voltage VB is higher than those on the sapphire substrate owing to the lower dislocation density. The breakdown voltage is further improved with decreasing Mg concentration in p-GaN layers. Analysis of the depletion-layer capacitance of pn diodes has revealed that the Mg acceptors are fully ionized in the depletion layer. By optimizing the growth conditions, the diodes on GaN substrates show extremely low leakage current and the ideal hard breakdown at -925 V. The breakdown field is estimated to be 3.27 MV/cm. The specific on-resistance RON of 6.3 mΩ cm 2 is obtained, leading to the figure of merit, VB2/R, of 136 MW/cm 2.

  17. S-Band Shallow Bulk Acoustic Wave (SBAW) microwave source

    NASA Technical Reports Server (NTRS)

    1981-01-01

    Techniques necessary to fabricate a high performance S-band microwave single source using state-of-the-art shallow bulk acoustic wave (SBAW) were explored. The bulk wave structures of the AlN/Al 2O3 were investigated for both the R plane and basal plane of sapphire. A 1.072 GHz SBAW delay line and oscillators were developed. A method of selecting and setting oscillator output frequency by selecting substrate orientation angle was also established.

  18. Combined CW ring single-frequency Ti:sapphire/dye laser for atom cooling and high-precision spectroscopy

    NASA Astrophysics Data System (ADS)

    Kobtsev, Sergey; Baraulya, Vladimir; Lunin, Vladimir

    2007-04-01

    Presented in the work are the results of the development of a new combined CW ring single-frequency laser with universal design that allows efficient use as the active medium of both a Ti:Sapphire crystal and a dye jet. For the first time such combination has been implemented in a horizontal resonator configuration that offers an improvement of stability in the position of optical elements and more convenient operation. The short-term line width without the frequency stabilisation is less than 5 MHz (Ti:Sapphire) and < 10 MHz (Dye); with the frequency stabilisation to a specially designed thermo-stabilised reference interferometer with high finesse, the line width is less than 10 kHz (Ti:Sapphire) and 90 kHz (Dye), output frequency drift being less than 25 MHz/hour. The total working spectral range of the combined laser stretches from 550 to 1000 nm (550-770 nm for the Dye and 695-1000 nm for Ti:Sapphire) when pumped with 532/515-nm radiation. The maximum output power with a 10-W pump exceeds 2 W for the Ti:Sapphire configuration and is > 1 .5 W for the Dye one.

  19. Origin of sapphires from a lamprophyre dike at Yogo Gulch, Montana, USA: Clues from their melt inclusions

    NASA Astrophysics Data System (ADS)

    Palke, Aaron C.; Renfro, Nathan D.; Berg, Richard B.

    2016-09-01

    Gem corundum (sapphire) has been mined from an ultramafic lamprophyre dike at Yogo Gulch in central Montana for over 100 years. The sapphires bear signs of corrosion showing that they were not in equilibrium with the lamprophyre that transported them; however, their genesis is poorly understood. We report here the observation of minute glassy melt inclusions in Yogo sapphires. These inclusions are Na- and Ca-rich, Fe-, Mg-, and K-poor silicate glasses with compositions unlike that of the host lamprophyre. Larger, recrystallized melt inclusions contain analcime and calcite drawing a striking resemblance to leucocratic ocelli in the lamprophyre. We suggest here that sapphires formed through partial melting of Al-rich rocks, likely as the lamprophyre pooled at the base of the continental crust. This idea is corroborated by MELTS calculations on a kyanite-eclogite protolith which was presumably derived from a troctolite precursor. These calculations suggest that corundum can form through peritectic melting of kyanite. Linking the melt inclusions petrologically to the lamprophyre represents a significant advancement in our understanding of sapphire genesis and sheds light on how mantle-derived magmas may interact with the continental crust on their ascent to the surface.

  20. Gain-switched Ti:sapphire laser-based photoacoustic imaging.

    PubMed

    Lee, Jisu; Lee, Yong-Jae; Jeong, Eun Ju; Jung, Moon Youn; Lee, Susung; Kim, Bong Kyu; Song, Dong Hoon

    2016-07-10

    We demonstrate photoacoustic (PA) imaging using a compact gain-switched Ti:sapphire laser. Additionally, a simple laser configuration is provided. The Ti:sapphire laser is pumped using a frequency-doubled pulsed neodymium-doped yttrium aluminum garnet pulse laser operating at a repetition rate of 10 Hz, with a pump energy of 37 mJ. No water cooling is required for the Ti:sapphire crystal. The output pulse energy and pulse duration of the laser are 13.6 mJ and 11 ns, respectively. Thus, the power conversion efficiency is 36.7%. As the end mirror in a laser cavity is adjusted in a horizontal direction, the output wavelength can be tuned within a range of 725-880 nm with a spectral bandwidth of approximately 1 nm. The laser has a small footprint size of 50 cm×35 cm including even laser pumping. Because the near-infrared region has significant advantages in the context of absorption and scattering in biological tissues, our laser can be used for PA imaging. Apart from obtaining PA images of a tube filled with indocyanine green immersed in water and placed under chicken breast tissue, our laser system could also be used for the simultaneous PA and ultrasound (US) dual-modality imaging of blood vessels lying beneath the skin of a human middle finger. We used a commercially available US machine for the PA and US dual-modality imaging. PMID:27409320