Measurements of the hard-x-ray reflectivity of iridium

DOE Office of Scientific and Technical Information (OSTI.GOV)

Romaine, S.; Bruni, R.; Gorenstein, P.

2007-01-10

In connection with the design of a hard-x-ray telescope for the Constellation X-Ray Observatory we measured the reflectivity of an iridium-coated zerodur substrate as a function of angle at 55, 60, 70, and 80 keV at the National Synchrotron Light Source of Brookhaven National Laboratory. The optical constants were derived from the reflectivity data. The real component of the index of refraction is in excellent agreement with theoretical values at all four energies. However, the imaginary component, which is related to the mass attenuation coefficient, is 50% to 70% larger at 55, 60, and 70 keV than theoretical values.

Measurements of the hard-x-ray reflectivity of iridium.

PubMed

Romaine, S; Bruni, R; Gorenstein, P; Zhong, Z

2007-01-10

In connection with the design of a hard-x-ray telescope for the Constellation X-Ray Observatory we measured the reflectivity of an iridium-coated zerodur substrate as a function of angle at 55, 60, 70, and 80 keV at the National Synchrotron Light Source of Brookhaven National Laboratory. The optical constants were derived from the reflectivity data. The real component of the index of refraction is in excellent agreement with theoretical values at all four energies. However, the imaginary component, which is related to the mass attenuation coefficient, is 50% to 70% larger at 55, 60, and 70 keV than theoretical values.

Characterization of New Hard X-ray Cataclysmic Variables

NASA Technical Reports Server (NTRS)

Bernardini, F.; deMartino, D.; Falanga, M.; Mukai, K.; Matt, G.; Bonnet-Bidaud, J.-M.; Masetti, N.; Mouchet, M.

2012-01-01

Aims. We aim at characterizing a sample of nine new hard X-ray selected Cataclysmic Variable (CVs), to unambiguously identify them as magnetic systems of the Intermediate Polar (IP) type. Methods. We performed detailed timing and spectral analysis by using X-ray, and simultaneous UV and optical data collected by XMM-Newton, complemented with hard X-ray data provided by INTEGRAL and Swift. The pulse arrival time were used to estimate the orbital periods. The broad band X-ray spectra were fitted using composite models consisting of different absorbing columns and emission components. Results. Strong X-ray pulses at the White Dwarf (WD) spin period are detected and found to decrease with energy. Most sources are spin-dominated systems in the X-rays, though four are beat dominated at optical wavelengths. We estimated the orbital period in all system (except for IGR J16500-3307), providing the first estimate for IGRJ08390-4833, IGRJ18308-1232, and IGR J18173-2509. All X-ray spectra are multi-temperature. V2069 Cyg and RX J0636+3535 poses a soft X-ray optically thick component at kT approx. 80 eV. An intense K (sub alpha) Fe line at 6.4 keV is detected in all sources. An absorption edge at 0.76 keV from OVII is detected in IGR J08390-4833. The WD masses and lower limits to the accretion rates are also estimated. Conclusions. We found all sources to be IPs. IGR J08390-4833, V2069 Cyg, and IGR J16500-3307 are pure disc accretors, while IGR J18308-1232, IGR J1509-6649, IGR J17195-4100, and RX J0636+3535 display a disc-overflow accretion mode. All sources show a temperature gradient in the post-shock regions and a highly absorbed emission from material located in the pre-shock flow which is also responsible for the X-ray pulsations. Reflection at the WD surface is likely the origin of the fluorescent iron line. There is an increasing evidence for the presence of a warm absorber in IPs, a feature that needs future exploration. The addition of two systems to the subgroup of

Real-time X-ray Diffraction: Applications to Materials Characterization

NASA Technical Reports Server (NTRS)

Rosemeier, R. G.

1984-01-01

With the high speed growth of materials it becomes necessary to develop measuring systems which also have the capabilities of characterizing these materials at high speeds. One of the conventional techniques of characterizing materials was X-ray diffraction. Film, which is the oldest method of recording the X-ray diffraction phenomenon, is not quite adequate in most circumstances to record fast changing events. Even though conventional proportional counters and scintillation counters can provide the speed necessary to record these changing events, they lack the ability to provide image information which may be important in some types of experiment or production arrangements. A selected number of novel applications of using X-ray diffraction to characterize materials in real-time are discussed. Also, device characteristics of some X-ray intensifiers useful in instantaneous X-ray diffraction applications briefly presented. Real-time X-ray diffraction experiments with the incorporation of image X-ray intensification add a new dimension in the characterization of materials. The uses of real-time image intensification in laboratory and production arrangements are quite unlimited and their application depends more upon the ingenuity of the scientist or engineer.

Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

DOE Office of Scientific and Technical Information (OSTI.GOV)

Singh, Surendra, E-mail: surendra@barc.gov.in; Basu, Saibal

2016-05-23

X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependentmore » structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.« less

Surface layering and melting in an ionic liquid studied by resonant soft X-ray reflectivity

PubMed Central

Mezger, Markus; Ocko, Benjamin M.; Reichert, Harald; Deutsch, Moshe

2013-01-01

The molecular-scale structure of the ionic liquid [C18mim]+[FAP]− near its free surface was studied by complementary methods. X-ray absorption spectroscopy and resonant soft X-ray reflectivity revealed a depth-decaying near-surface layering. Element-specific interfacial profiles were extracted with submolecular resolution from energy-dependent soft X-ray reflectivity data. Temperature-dependent hard X-ray reflectivity, small- and wide-angle X-ray scattering, and infrared spectroscopy uncovered an intriguing melting mechanism for the layered region, where alkyl chain melting drove a negative thermal expansion of the surface layer spacing. PMID:23431181

Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors.

PubMed

Xu, Dechao; Huang, Qiushi; Wang, Yiwen; Li, Pin; Wen, Mingwu; Jonnard, Philippe; Giglia, Angelo; Kozhevnikov, Igor V; Wang, Kun; Zhang, Zhong; Wang, Zhanshan

2015-12-28

Pd/Y multilayer mirrors operating in the soft X-ray region are characterized by a high theoretical reflectance, reaching 65% at normal incidence in the 8-12 nm wavelength range. However, a severe intermixing of neighboring Pd and Y layers results in an almost total disappearance of the interfaces inside the multilayer structures fabricated by direct current magnetron sputtering and thus a dramatic reflectivity decrease. Based on grazing incidence X-ray reflectometry and X-ray photoelectron spectroscopy, we demonstrate that the stability of the interfaces in Pd/Y multilayer structures can be essentially improved by adding a small amount of nitrogen (4-8%) to the working gas (Ar). High resolution transmission electron microscopy shows that the interlayer width is only 0.9 nm and 0.6 nm for Y(N)-on-Pd(N) and Pd(N)-on-Y(N) interfaces, respectively. A well-defined crystalline texture of YN (200) is observed on the electron diffraction pattern. As a result, the measured reflectance of the Pd(N)/Y(N) multilayer achieves 30% at λ = 9.3 nm. The peak reflectivity value is limited by the remaining interlayers and the formation of the YN compound inside the yttrium layers, resulting in an increased absorption.

Relativistic Effects on Reflection X-ray Spectra of AGN

DOE Office of Scientific and Technical Information (OSTI.GOV)

Lee, Khee-Gan; /University Coll. London; Fuerst, Steven V.

2007-01-05

We have calculated the reflection component of the X-ray spectra of active galactic nuclei (AGN) and shown that they can be significantly modified by the relativistic motion of the accretion flow and various gravitational effects of the central black hole. The absorption edges in the reflection spectra suffer severe energy shifts and smearing. The degree of distortion depends on the system parameters, and the dependence is stronger for some parameters such as the inner radius of the accretion disk and the disk viewing inclination angles. The relativistic effects are significant and are observable. Improper treatment of the reflection component ofmore » the X-ray continuum in spectral fittings will give rise to spurious line-like features, which will mimic the fluorescent emission lines and mask the relativistic signatures of the lines.« less

Diffraction imaging for in situ characterization of double-crystal X-ray monochromators

DOE PAGES

Stoupin, Stanislav; Liu, Zunping; Heald, Steve M.; ...

2015-10-30

In this paper, imaging of the Bragg-reflected X-ray beam is proposed and validated as an in situ method for characterization of the performance of double-crystal monochromators under the heat load of intense synchrotron radiation. A sequence of images is collected at different angular positions on the reflectivity curve of the second crystal and analyzed. The method provides rapid evaluation of the wavefront of the exit beam, which relates to local misorientation of the crystal planes along the beam footprint on the thermally distorted first crystal. The measured misorientation can be directly compared with the results of finite element analysis. Finally,more » the imaging method offers an additional insight into the local intrinsic crystal quality over the footprint of the incident X-ray beam.« less

The approach to reflection x-ray microscopy below the critical angles

NASA Astrophysics Data System (ADS)

Artyukov, Igor A.; Busarov, Alexander; Popov, Nikolay L.; Vinogradov, Alexander V.

2017-05-01

There is a quest for new knowledge and methods to study various materials and processes on surfaces and interfaces at the nanoscale. It concerns ablation, phase transitions, physical and chemical transformations, dissolution, selforganization etc. Obviously, to achieve an appropriate resolution it is necessary to use a corresponding wavelength . Higher resolution can be obtained with shorter wavelengths. On the other hand, in surface modification, ablation, study of buried interfaces etc. the penetration length of radiation into the materials, which depends on the wavelength and angle of incidence, plays important role... Considering these factors the experimental studies in nano-physics and nanotechnology are usually carried out using X-ray radiation with a photon energy of 0.1-10 keV. As far as surfaces and films are investigated, it is reasonable to use an X-ray microscope operating in the reflection mode. However, in this spectral range a substantial portion of the radiation is reflected only at small grazing angles (e.g. <= 10°). Thus, the idea of grazing incidence reflection-mode X-ray microscope has been developed. In this paper, we consider one of possible schemes of such an X-ray microscope. Our analysis and simulation is based on the extension of the Fresnel propagation theory to tilted object problems.

Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions☆

PubMed Central

Ingerle, D.; Meirer, F.; Pepponi, G.; Demenev, E.; Giubertoni, D.; Wobrauschek, P.; Streli, C.

2014-01-01

The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

Modeling multilayer x-ray reflectivity using genetic algorithms

NASA Astrophysics Data System (ADS)

Sánchez del Río, M.; Pareschi, G.; Michetschläger, C.

2000-06-01

The x-ray reflectivity of a multilayer is a non-linear function of many parameters (materials, layer thickness, density, roughness). Non-linear fitting of experimental data with simulations requires the use of initial values sufficiently close to the optimum value. This is a difficult task when the topology of the space of the variables is highly structured. We apply global optimization methods to fit multilayer reflectivity. Genetic algorithms are stochastic methods based on the model of natural evolution: the improvement of a population along successive generations. A complete set of initial parameters constitutes an individual. The population is a collection of individuals. Each generation is built from the parent generation by applying some operators (selection, crossover, mutation, etc.) on the members of the parent generation. The pressure of selection drives the population to include "good" individuals. For large number of generations, the best individuals will approximate the optimum parameters. Some results on fitting experimental hard x-ray reflectivity data for Ni/C and W/Si multilayers using genetic algorithms are presented. This method can also be applied to design multilayers optimized for a target application.

Compact X-ray sources: X-rays from self-reflection

NASA Astrophysics Data System (ADS)

Mangles, Stuart P. D.

2012-05-01

Laser-based particle acceleration offers a way to reduce the size of hard-X-ray sources. Scientists have now developed a simple scheme that produces a bright flash of hard X-rays by using a single laser pulse both to generate and to scatter an electron beam.

Tutorial on X-ray photon counting detector characterization.

PubMed

Ren, Liqiang; Zheng, Bin; Liu, Hong

2018-01-01

Recent advances in photon counting detection technology have led to significant research interest in X-ray imaging. As a tutorial level review, this paper covers a wide range of aspects related to X-ray photon counting detector characterization. The tutorial begins with a detailed description of the working principle and operating modes of a pixelated X-ray photon counting detector with basic architecture and detection mechanism. Currently available methods and techniques for charactering major aspects including energy response, noise floor, energy resolution, count rate performance (detector efficiency), and charge sharing effect of photon counting detectors are comprehensively reviewed. Other characterization aspects such as point spread function (PSF), line spread function (LSF), contrast transfer function (CTF), modulation transfer function (MTF), noise power spectrum (NPS), detective quantum efficiency (DQE), bias voltage, radiation damage, and polarization effect are also remarked. A cadmium telluride (CdTe) pixelated photon counting detector is employed for part of the characterization demonstration and the results are presented. This review can serve as a tutorial for X-ray imaging researchers and investigators to understand, operate, characterize, and optimize photon counting detectors for a variety of applications.

X-ray Reflected Spectra from Accretion Disk Models. III. A Complete Grid of Ionized Reflection Calculations

NASA Technical Reports Server (NTRS)

Garcia, J.; Dauser, T.; Reynolds, C. S.; Kallman, T. R.; McClintock, J. E.; Wilms, J.; Ekmann, W.

2013-01-01

We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code xillver that incorporates new routines and a richer atomic data base. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index Gamma of the illuminating radiation, the ionization parameter zeta at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A(sub Fe) relative to the solar value. The ranges of the parameters covered are: 1.2 <= Gamma <= 3.4, 1 <= zeta <= 104, and 0.5 <= A(sub Fe) <= 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file suitable for the analysis of X-ray observations via the atable model in xspec. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of xillver.

A soft X-ray beam-splitting multilayer optic for the NASA GEMS Bragg Reflection Polarimeter

DOE PAGES

Allured, Ryan; Kaaret, Philip; Fernandez-Perea, Monica; ...

2013-04-12

A soft X-ray, beam-splitting, multilayer optic has been developed for the Bragg Reflection Polarimeter (BRP) on the NASA Gravity and Extreme Magnetism Small Explorer Mission (GEMS). The optic is designed to reflect 0.5 keV X-rays through a 90° angle to the BRP detector, and transmit 2–10 keV X-rays to the primary polarimeter. The transmission requirement prevents the use of a thick substrate, so a 2 μm thick polyimide membrane was used. Atomic force microscopy has shown the membrane to possess high spatial frequency roughness less than 0.2 nm rms, permitting adequate X-ray reflectance. A multilayer thin film was especially developedmore » and deposited via magnetron sputtering with reflectance and transmission properties that satisfy the BRP requirements and with near-zero stress. Furthermore, reflectance and transmission measurements of BRP prototype elements closely match theoretical predictions, both before and after rigorous environmental testing.« less

A soft X-ray beam-splitting multilayer optic for the NASA GEMS Bragg Reflection Polarimeter

DOE Office of Scientific and Technical Information (OSTI.GOV)

Allured, Ryan; Kaaret, Philip; Fernandez-Perea, Monica

A soft X-ray, beam-splitting, multilayer optic has been developed for the Bragg Reflection Polarimeter (BRP) on the NASA Gravity and Extreme Magnetism Small Explorer Mission (GEMS). The optic is designed to reflect 0.5 keV X-rays through a 90° angle to the BRP detector, and transmit 2–10 keV X-rays to the primary polarimeter. The transmission requirement prevents the use of a thick substrate, so a 2 μm thick polyimide membrane was used. Atomic force microscopy has shown the membrane to possess high spatial frequency roughness less than 0.2 nm rms, permitting adequate X-ray reflectance. A multilayer thin film was especially developedmore » and deposited via magnetron sputtering with reflectance and transmission properties that satisfy the BRP requirements and with near-zero stress. Furthermore, reflectance and transmission measurements of BRP prototype elements closely match theoretical predictions, both before and after rigorous environmental testing.« less

When is one layer complete? Using simultaneous in-situ RHEED and x-ray reflectivity to map layer-by-layer thin-film oxide growth

NASA Astrophysics Data System (ADS)

Sullivan, M. C.; Ward, M. J.; Joress, H.; Gutierrez-Llorente, A.; White, A. E.; Woll, A.; Brock, J. D.

2014-03-01

The most popular tool for characterizing in situ layer-by-layer growth is Reflection High-Energy Electron Diffraction (RHEED). X-ray reflectivity can also be used to study layer-by-layer growth, as long as the incident angle of the x-rays is far from a Bragg peak. During layer-by-layer homoepitaxial growth, both the RHEED intensity and the reflected x-ray intensity will oscillate, and each complete oscillation indicates the addition of one layer of material. However, it is well documented, but not well understood, that the maxima in the RHEED intensity oscillations do not necessarily occur at the completion of a layer. In contrast, the maxima in the x-ray intensity oscillations do occur at the completion of a layer, thus the RHEED and x-ray oscillations are rarely in phase. We present our results on simultaneous in situ x-ray reflectivity and RHEED during layer-by-layer growth of SrTiO3 and discuss how to determine the completion of a layer for RHEED oscillations independent of the phase of the RHEED oscillation. Supported by DOE Office of Basic Energy Sciences Award DE-SC0001086, CHESS is supported by the NSF & NIH/NIGMS via NSF award DMR-0936384.

Crystals and collimators for X-ray spectrometry. [Bragg reflection properties and design for astronomical applications

NASA Technical Reports Server (NTRS)

Mckenzie, D. L.; Landecker, P. B.; Underwood, J. H.

1976-01-01

Results of the measurement of Bragg reflection properties of crystals suitable for use in X-ray astronomy are presented. Measurements with a double crystal spectrometer were performed on rubidium acid phthalate and thallium acid phthalate to yield values of the integrated reflectivity and diffraction width in the range 8-18 A, and measurements of integrated reflectivity were also performed on ammonium dihydrogen phosphate. The theory and design of an arc-minute range multigrid collimator to be flown on a rocket for solar X-ray studies are also described, along with a method for determining the collimator's X-ray axis.

X-RAY REFLECTED SPECTRA FROM ACCRETION DISK MODELS. III. A COMPLETE GRID OF IONIZED REFLECTION CALCULATIONS

DOE Office of Scientific and Technical Information (OSTI.GOV)

Garcia, J.; McClintock, J. E.; Dauser, T.

2013-05-10

We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code XILLVER that incorporates new routines and a richer atomic database. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index {Gamma} of the illuminating radiation, the ionization parameter {xi} at the surface of the disk (i.e., the ratio of the X-ray flux to themore » gas density), and the iron abundance A{sub Fe} relative to the solar value. The ranges of the parameters covered are 1.2 {<=} {Gamma} {<=} 3.4, 1 {<=} {xi} {<=} 10{sup 4}, and 0.5 {<=} A{sub Fe} {<=} 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file (http://hea-www.cfa.harvard.edu/{approx}javier/xillver/) suitable for the analysis of X-ray observations via the atable model in XSPEC. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of XILLVER.« less

JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants

NASA Astrophysics Data System (ADS)

Ingerle, D.; Pepponi, G.; Meirer, F.; Wobrauschek, P.; Streli, C.

2016-04-01

Grazing incidence XRF (GIXRF) is a very surface sensitive, nondestructive analytical tool making use of the phenomenon of total external reflection of X-rays on smooth polished surfaces. In recent years the method experienced a revival, being a powerful tool for process analysis and control in the fabrication of semiconductor based devices. Due to the downscaling of the process size for semiconductor devices, junction depths as well as layer thicknesses are reduced to a few nanometers, i.e. the length scale where GIXRF is highly sensitive. GIXRF measures the X-ray fluorescence induced by an X-ray beam incident under varying grazing angles and results in angle dependent intensity curves. These curves are correlated to the layer thickness, depth distribution and mass density of the elements in the sample. But the evaluation of these measurements is ambiguous with regard to the exact distribution function for the implants as well as for the thickness and density of nanometer-thin layers. In order to overcome this ambiguity, GIXRF can be combined with X-ray reflectometry (XRR). This is straightforward, as both techniques use similar measurement procedures and the same fundamental physical principles can be used for a combined data evaluation strategy. Such a combined analysis removes ambiguities in the determined physical properties of the studied sample and, being a correlative spectroscopic method, also significantly reduces experimental uncertainties of the individual techniques. In this paper we report our approach to a correlative data analysis, based on a concurrent calculation and fitting of simultaneously recorded GIXRF and XRR data. Based on this approach we developed JGIXA (Java Grazing Incidence X-ray Analysis), a multi-platform software package equipped with a user-friendly graphic user interface (GUI) and offering various optimization algorithms. Software and data evaluation approach were benchmarked by characterizing metal and metal oxide layers on

Electron cyclotron resonance ion source plasma characterization by X-ray spectroscopy and X-ray imaging

DOE Office of Scientific and Technical Information (OSTI.GOV)

Mascali, David, E-mail: davidmascali@lns.infn.it; Castro, Giuseppe; Celona, Luigi

2016-02-15

An experimental campaign aiming to investigate electron cyclotron resonance (ECR) plasma X-ray emission has been recently carried out at the ECRISs—Electron Cyclotron Resonance Ion Sources laboratory of Atomki based on a collaboration between the Debrecen and Catania ECR teams. In a first series, the X-ray spectroscopy was performed through silicon drift detectors and high purity germanium detectors, characterizing the volumetric plasma emission. The on-purpose developed collimation system was suitable for direct plasma density evaluation, performed “on-line” during beam extraction and charge state distribution characterization. A campaign for correlating the plasma density and temperature with the output charge states and themore » beam intensity for different pumping wave frequencies, different magnetic field profiles, and single-gas/gas-mixing configurations was carried out. The results reveal a surprisingly very good agreement between warm-electron density fluctuations, output beam currents, and the calculated electromagnetic modal density of the plasma chamber. A charge-coupled device camera coupled to a small pin-hole allowing X-ray imaging was installed and numerous X-ray photos were taken in order to study the peculiarities of the ECRIS plasma structure.« less

X-ray reflection from cold white dwarfs in magnetic cataclysmic variables

NASA Astrophysics Data System (ADS)

Hayashi, Takayuki; Kitaguchi, Takao; Ishida, Manabu

2018-02-01

We model X-ray reflection from white dwarfs (WDs) in magnetic cataclysmic variables (mCVs) using a Monte Carlo simulation. A point source with a power-law spectrum or a realistic post-shock accretion column (PSAC) source irradiates a cool and spherical WD. The PSAC source emits thermal spectra of various temperatures stratified along the column according to the PSAC model. In the point-source simulation, we confirm the following: a source harder and nearer to the WD enhances the reflection; higher iron abundance enhances the equivalent widths (EWs) of fluorescent iron Kα1, 2 lines and their Compton shoulder, and increases the cut-off energy of a Compton hump; significant reflection appears from an area that is more than 90° apart from the position right under the point X-ray source because of the WD curvature. The PSAC simulation reveals the following: a more massive WD basically enhances the intensities of the fluorescent iron Kα1, 2 lines and the Compton hump, except for some specific accretion rate, because the more massive WD makes a hotter PSAC from which higher-energy X-rays are preferentially emitted; a larger specific accretion rate monotonically enhances the reflection because it makes a hotter and shorter PSAC; the intrinsic thermal component hardens by occultation of the cool base of the PSAC by the WD. We quantitatively estimate the influences of the parameters on the EWs and the Compton hump with both types of source. We also calculate X-ray modulation profiles brought about by the WD spin. These depend on the angles of the spin axis from the line of sight and from the PSAC, and on whether the two PSACs can be seen. The reflection spectral model and the modulation model involve the fluorescent lines and the Compton hump and can directly be compared to the data, which allows us to estimate these geometrical parameters with unprecedented accuracy.

Cr/B 4C multilayer mirrors: Study of interfaces and X-ray reflectance

DOE PAGES

Burcklen, C.; Soufli, R.; Gullikson, E.; ...

2016-03-24

Here, we present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B 4C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B 4C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L 2,3 absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulatedmore » refractive index (optical constants) values for Cr.« less

Characterization of Beryllium Windows for Coherent X-ray Optics

DOE Office of Scientific and Technical Information (OSTI.GOV)

Goto, Shunji; Yabashi, Makina; Tamasaku, Kenji

2007-01-19

Beryllium foils fabricated by several processes were characterized using spatially coherent x rays at 1-km beamline of SPring-8. By thickness dependence of bright x-ray spot density due to Fresnel diffraction from several-micron deficiencies, we found that speckles (bright x-ray spots) were due to voids with densities 103-104 mm-3 in powder foils and ingot foils. Compared with powder and ingot foils, a polished physical-vapor-deposited (PVD) beryllium foil gave highly uniform beams with no speckles. The PVD process eliminates the internal voids in principle and the PVD foil is the best for coherent x-ray applications.

X-ray beamsplitter

DOEpatents

Ceglio, Natale M.; Stearns, Daniel S.; Hawryluk, Andrew M.; Barbee, Jr., Troy W.

1989-01-01

An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5-50 pairs of alternate Mo/Si layers with a period of 20-250 A. The support membrane is 10-200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window.

Measured reflectance of graded multilayer mirrors designed for astronomical hard X-ray telescopes

NASA Astrophysics Data System (ADS)

Christensen, F. E.; Craig, W. W.; Windt, D. L.; Jimenez-Garate, M. A.; Hailey, C. J.; Harrison, F. A.; Mao, P. H.; Chakan, J. M.; Ziegler, E.; Honkimaki, V.

2000-09-01

Future astronomical X-ray telescopes, including the balloon-borne High-Energy Focusing Telescope (HEFT) and the Constellation-X Hard X-ray Telescope (Con-X HXT) plan to incorporate depth-graded multilayer coatings in order to extend sensitivity into the hard X-ray (10<~E<~80keV) band. In this paper, we present measurements of the reflectance in the 18-170 keV energy range of a cylindrical prototype nested optic taken at the European Synchrotron Radiation Facility (ESRF). The mirror segments, mounted in a single bounce stack, are coated with depth-graded W/Si multilayers optimized for broadband performance up to 69.5 keV (WK-edge). These designs are ideal for both the HEFT and Con-X HXT applications. We compare the measurements to model calculations to demonstrate that the reflectivity can be well described by the intended power law distribution of the bilayer thicknesses, and that the coatings are uniform at the 5% level over the mirror surface. Finally, we apply the measurements to predict effective areas achievable for HEFT and Con-X HXT using these W/Si designs.

[Technology Development for X-Ray Reflection for the Constellation-X Reflection Grating Spectrometer (RGS)

NASA Technical Reports Server (NTRS)

Schattenburg, Mark L.

2003-01-01

This Grant covers MIT support for the technology development of x-ray reflection gratings for the Constellation-X Reflection Grating Spectrometer (RGS). Since the start of the Grant MIT has extended its previously-developed patterning and super-smooth, blazed grating fabrication technology to ten-times smaller grating periods and ten-times larger blaze angles to demonstrate feasibility and performance in the off-plane grating geometry. In the past year we successfully developed several nanoimprint grating replication methods that achieved very high fidelity replication of master silicon gratings. Grating geometry on the nano and macro scales were faithfully replicated, demonstrating the viability of the process for manufacturing the thousands of gratings required for the RGS. We also successfully developed an improved metrology truss for holding test grating substrates during metrology. The flatness goal of grating substrates is under 500 nm. In the past, grating holders would cause non-repeatable distortion of >> 500 nm to the substrates due to friction and gravity sag. The new holder has a repeatability of under 50 nm which is adequate for the proposed RGS grating substrates.

X-ray beamsplitter

DOEpatents

Ceglio, N.M.; Stearns, D.G.; Hawryluk, A.M.; Barbee, T.W. Jr.

1987-08-07

An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5--50 pairs of alternate Mo/Si layers with a period of 20--250 A. The support membrane is 10--200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window. 6 figs.

Characterization of Scintillating X-ray Optical Fiber Sensors

PubMed Central

Sporea, Dan; Mihai, Laura; Vâţă, Ion; McCarthy, Denis; O'Keeffe, Sinead; Lewis, Elfed

2014-01-01

The paper presents a set of tests carried out in order to evaluate the design characteristics and the operating performance of a set of six X-ray extrinsic optical fiber sensors. The extrinsic sensor we developed is intended to be used as a low energy X-ray detector for monitoring radiation levels in radiotherapy, industrial applications and for personnel dosimetry. The reproducibility of the manufacturing process and the characteristics of the sensors were assessed. The sensors dynamic range, linearity, sensitivity, and reproducibility are evaluated through radioluminescence measurements, X-ray fluorescence and X-ray imaging investigations. Their response to the operating conditions of the excitation source was estimated. The effect of the sensors design and implementation, on the collecting efficiency of the radioluminescence signal was measured. The study indicated that the sensors are efficient only in the first 5 mm of the tip, and that a reflective coating can improve their response. Additional tests were done to investigate the concentricity of the sensors tip against the core of the optical fiber guiding the optical signal. The influence of the active material concentration on the sensor response to X-ray was studied. The tests were carried out by measuring the radioluminescence signal with an optical fiber spectrometer and with a Multi-Pixel Photon Counter. PMID:24556676

Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2

DOE Office of Scientific and Technical Information (OSTI.GOV)

Das, Gangadhar; Kane, S. R.; Khooha, Ajay

2015-05-15

A new multipurpose x-ray reflectometer station has been developed and augmented at the microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate synchronous measurements of specular x-ray reflectivity and grazing incidence x-ray fluorescence emission from thin layered structures. The design and various salient features of the x-ray reflectometer are discussed. The performance of the reflectometer has been evaluated by analyzing several thin layered structures having different surface interface properties. The results reveal in-depth information for precise determination of surface and interface properties of thin layered materials demonstrating the immense potential of the combined measurements of x-ray reflectivity and grazingmore » incidence fluorescence on a single reflectometer.« less

Probing interfacial reactions with x-ray reflectivity and x-ray reflection interface microscopy : influence of NaCl on the dissolution of orthoclase at pOH2 and 85 {degree} C.

DOE Office of Scientific and Technical Information (OSTI.GOV)

Fenter, P.; Lee, S. S.; Park, C.

2010-01-01

The role of electrolyte ions in the dissolution of orthoclase (0 0 1) in 0.01 m NaOH (pOH {approx} 2) at 84 {+-} 1 C is studied using a combination of in-situ X-ray reflectivity (XR) and ex-situ X-ray reflection interface microscopy (XRIM). The real-time XR measurements show characteristic intensity oscillations as a function of time indicative of the successive removal of individual layers. The dissolution rate in 0.01 m NaOH increases approximately linearly with increasing NaCl concentration up to 2 m NaCl. XRIM measurements of the lateral interfacial topography/structure were made for unreacted surfaces and those reacted in 0.01 mmore » NaOH/1.0 m NaCl solution for 15, 30 and 58 min. The XRIM images reveal that the dissolution reaction leads to the formation of micron-scale regions that are characterized by intrinsically lower reflectivity than the unreacted regions, and appears to be nucleated at steps and defect sites. The reflectivity signal from these reacted regions in the presence of NaCl in solution is significantly lower than that calculated from an idealized layer-by-layer dissolution process, as observed previously in 0.1 m NaOH in the absence of added electrolyte. This difference suggests that dissolved NaCl results in a higher terrace reactivity leading to a more three-dimensional process, consistent with the real-time XR measurements. These observations demonstrate the feasibility of XRIM to gain new insights into processes that control interfacial reactivity, specifically the role of electrolytes in feldspar dissolution at alkaline conditions.« less

X-ray reflectivity measurements of liquid/solid interfaces under high hydrostatic pressure conditions.

PubMed

Wirkert, Florian J; Paulus, Michael; Nase, Julia; Möller, Johannes; Kujawski, Simon; Sternemann, Christian; Tolan, Metin

2014-01-01

A high-pressure cell for in situ X-ray reflectivity measurements of liquid/solid interfaces at hydrostatic pressures up to 500 MPa (5 kbar), a pressure regime that is particularly important for the study of protein unfolding, is presented. The original set-up of this hydrostatic high-pressure cell is discussed and its unique properties are demonstrated by the investigation of pressure-induced adsorption of the protein lysozyme onto hydrophobic silicon wafers. The presented results emphasize the enormous potential of X-ray reflectivity studies under high hydrostatic pressure conditions for the in situ investigation of adsorption phenomena in biological systems.

Small Angle X-ray Scattering for Nanoparticle Research

DOE PAGES

Li, Tao; Senesi, Andrew J.; Lee, Byeongdu

2016-04-07

X-ray scattering is a structural characterization tool that has impacted diverse fields of study. It is unique in its ability to examine materials in real time and under realistic sample environments, enabling researchers to understand morphology at nanometer and ångström length scales using complementary small and wide angle X-ray scattering (SAXS, WAXS), respectively. Herein, we focus on the use of SAXS to examine nanoscale particulate systems. We provide a theoretical foundation for X-ray scattering, considering both form factor and structure factor, as well as the use of correlation functions, which may be used to determine a particle’s size, size distribution,more » shape, and organization into hierarchal structures. The theory is expanded upon with contemporary use cases. Both transmission and reflection (grazing incidence) geometries are addressed, as well the combination of SAXS with other X-ray and non-X ray characterization tools. Furthermore, we conclude with an examination of several key areas of research where X-rays scattering has played a pivotal role, including in situ nanoparticle synthesis, nanoparticle assembly, and in operando studies of catalysts and energy storage materials. Throughout this review we highlight the unique capabilities of X-ray scattering for structural characterization of materials in their native environment.« less

Small Angle X-ray Scattering for Nanoparticle Research

DOE Office of Scientific and Technical Information (OSTI.GOV)

Li, Tao; Senesi, Andrew J.; Lee, Byeongdu

X-ray scattering is a structural characterization tool that has impacted diverse fields of study. It is unique in its ability to examine materials in real time and under realistic sample environments, enabling researchers to understand morphology at nanometer and ångström length scales using complementary small and wide angle X-ray scattering (SAXS, WAXS), respectively. Herein, we focus on the use of SAXS to examine nanoscale particulate systems. We provide a theoretical foundation for X-ray scattering, considering both form factor and structure factor, as well as the use of correlation functions, which may be used to determine a particle’s size, size distribution,more » shape, and organization into hierarchal structures. The theory is expanded upon with contemporary use cases. Both transmission and reflection (grazing incidence) geometries are addressed, as well the combination of SAXS with other X-ray and non-X ray characterization tools. Furthermore, we conclude with an examination of several key areas of research where X-rays scattering has played a pivotal role, including in situ nanoparticle synthesis, nanoparticle assembly, and in operando studies of catalysts and energy storage materials. Throughout this review we highlight the unique capabilities of X-ray scattering for structural characterization of materials in their native environment.« less

Determination of fluorine by total reflection X-ray fluorescence spectrometry

NASA Astrophysics Data System (ADS)

Tarsoly, G.; Óvári, M.; Záray, Gy.

2010-04-01

There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). In this study, the analytical performance of the total reflection X-ray fluorescence spectrometry for determination of fluorine was investigated applying a spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a silicon drift detector (SDD) with ultra thin window was used. The detection limit for fluorine was found to be 5 mg L - 1 (equivalent to 10 ng absolute) in aqueous matrix. The linear range of the fluorine determination is between 15 and 500 mg L - 1 , within this range the precision is below 10%. The matrix effects of the other halogens (chlorine, bromine and iodine), and sulfate were also investigated. It has been established that the upper allowed concentration limit of the above interfering elements is 100, 200, 50 and 100 mg L - 1 for Cl, Br, I and sulfate, respectively. Moreover, the role of the pre-siliconization of the quartz carrier plate was investigated. It was found, that the presence of the silicone results in poorer analytical performance, which can be explained by the thicker sample residue and stronger self-absorption of the fluorescent radiation.

Method for characterization of a spherically bent crystal for K.alpha. X-ray imaging of laser plasmas using a focusing monochromator geometry

DOEpatents

Kugland, Nathan; Doeppner, Tilo; Glenzer, Siegfried; Constantin, Carmen; Niemann, Chris; Neumayer, Paul

2015-04-07

A method is provided for characterizing spectrometric properties (e.g., peak reflectivity, reflection curve width, and Bragg angle offset) of the K.alpha. emission line reflected narrowly off angle of the direct reflection of a bent crystal and in particular of a spherically bent quartz 200 crystal by analyzing the off-angle x-ray emission from a stronger emission line reflected at angles far from normal incidence. The bent quartz crystal can therefore accurately image argon K.alpha. x-rays at near-normal incidence (Bragg angle of approximately 81 degrees). The method is useful for in-situ calibration of instruments employing the crystal as a grating by first operating the crystal as a high throughput focusing monochromator on the Rowland circle at angles far from normal incidence (Bragg angle approximately 68 degrees) to make a reflection curve with the He-like x-rays such as the He-.alpha. emission line observed from a laser-excited plasma.

Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structures.

PubMed

Hayashi, Kouichi

2010-12-01

Based on our previous work, I review the applications of x-ray refraction and the x-ray waveguide phenomenon to organic and inorganic thin films in the present paper. Under grazing incidence conditions, observations of refracted x-rays and guided x-rays due to the x-ray waveguide phenomenon provide information about thin film structures, and thus have potential as alternative methods to x-ray reflectivity. To date, we have measured the spectra of the refracted x-rays and guided x-rays from end faces of thin films using white incident x-ray beams, and utilized them for the determination of film density and thickness. Some of this work is summarized in the present paper. At the end of this paper, I describe our recent achievement in this field, namely the in situ measurement of guided x-rays during the film degradation process due to strong synchrotron radiation damage. Moreover, I discuss the perspective of the present technique from the viewpoint of micro-characterization and real-time estimation of thin films.

Reflectivity around the gold L-edges of x-ray reflector of the soft x-ray telescope onboard ASTRO-H

NASA Astrophysics Data System (ADS)

Maeda, Yoshitomo; Kikuchi, Naomichi; Kurashima, Sho; Ishida, Manabu; Iizuka, Ryo; Hayashi, Takayuki; Okajima, Takashi; Matsumoto, Hironori; Mitsuishi, Ikuyuki; Saji, Shigetaka; Sato, Toshiki; Tachibana, Sasagu; Mori, Hideyuki; Christensen, Finn; Brejnholt, Nicolai; Nitta, Kiyofumi; Uruga, Tomoya

2016-07-01

We report the atomic scattering factor in the 11.2{15.4 keV for the ASTRO-H Soft X-ray Telescope (SXT)9 obtained in the ground based measurements. The large effective area of the SXT covers above 10 keV. In fact, the flight data show the spectra of the celestical objects in the hard X-ray band. In order to model the area, the reflectivity measurements in the 11.2{15.4 keV band with the energy pitch of 0.4 { 0.7 eV were made in the synchrotron beamline Spring-8 BL01B1. We obtained atomic scattering factors f1 and f2 by the curve fitting to the reflectivities of our witness sample. The edges associated with the gold's L-I, II, and III transitions are identified, of which the depths are found to be roughly 60% shallower than those expected from the Henke's atomic scattering factor.

Reflectivity Around the Gold L-Edges of X-Ray Reflector of the Soft X-Ray Telescope Onboard ASTRO-H

NASA Technical Reports Server (NTRS)

Maeda, Yoshitomo; Kikuchi, Naomichi; Kurashima, Sho; Ishida, Manabu; Iizuka, Ryo; Hayashi, Takayuki; Okajima, Takashi; Matsumoto, Hironori; Mitsuishi, Ikuyuki; Saji, Shigetaka;

A new spectrometer for total reflection X-ray fluorescence analysis of light elements

NASA Astrophysics Data System (ADS)

Streli, Christina; Wobrauschek, Peter; Unfried, Ernst; Aiginger, Hannes

1993-10-01

A new spectrometer for total reflection X-ray fluorescence analysis (TXRF) of light elements as C, N, O, F, Na,… has been designed, constructed and realized. This was done under the aspect of optimizing all relevant parameters for excitation and detection under the conditions of Total Reflection in a vacuum chamber. A commercially available Ge(HP) detector with a diamond window offering a high transparency for low energy radiation was used. As excitation sources a special self-made windowless X-ray tube with Cu-target as well as a standard fine-focus Cr-tube were applied. Detection limits achieved are in the ng range for Carbon and Oxygen.

X-ray microscopy using reflection targets based on SEM with tungsten filament

NASA Astrophysics Data System (ADS)

Liu, Junbiao; Ma, Yutian; Zhao, Weixia; Niu, Geng; Chu, Mingzhang; Yin, Bohua; Han, Li; Liu, Baodong

2016-10-01

X-ray MicroandNano imaging is developed based on the conventional x-ray tomography, it can not only provide nondestructive testing with higher resolution measurement, but also be used to examine the material or the structure with low atomic number and low density. The source with micro-focal spot size is one of the key components of x-ray MicroandNano imaging. The focused electron beam from SEM bombarding the metal target can generate x-ray with ultra-small size. It is convenient to set up x-ray microscopy based on SEM for laboratory use. This paper describes a new x-ray microscopy using reflection targets based on FEI Quanta600 SEM with tungsten filament. The flat panel detector is placed outside of the vacuum chamber with 300μm thickness Be-window to isolate vacuum from the air. A stage with 3 DOFs is added to adjust the positions of the target, the SEM's sample stage is used to move sample. And the shape of target is designed as cone with 60° half cone angle to get the maximum x-ray dosage. The attenuation coefficient of Bewindow for x-ray is about 25%. Finally, the line pair card is used to evaluate the resolution and the result shows that the resolution of the system can receive less than 750nm, when the acceleration voltage is 30keV, the beam current is 160nA, the SEM working distance is 5mm and the acquisition time of the detector is 60s.

Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere

DOEpatents

Thoe, Robert S.

1991-01-01

Method and apparatus for producing sharp, chromatic, magnified images of X-ray emitting objects, are provided. The apparatus, which constitutes an X-ray microscope or telescope, comprises a connected collection of Bragg reflecting planes, comprised of either a bent crystal or a synthetic multilayer structure, disposed on and adjacent to a locus determined by a spherical surface. The individual Bragg planes are spatially oriented to Bragg reflect radiation from the object location toward the image location. This is accomplished by making the Bragg planes spatially coincident with the surfaces of either a nested series of prolate ellipsoids of revolution, or a nested series of spheres. The spacing between the Bragg reflecting planes can be tailored to control the wavelengths and the amount of the X-radiation that is Bragg reflected to form the X-ray image.

Reflective Coating for Lightweight X-Ray Optics

NASA Technical Reports Server (NTRS)

Chan, Kai-Wing; Zhang, William W.; Windt, David; Hong, Mao-Ling; Saha, Timo; McClelland, Ryan; Sharpe, Marton; Dwivedi, Vivek H.

2012-01-01

X-ray reflective coating for next generation's lightweight, high resolution, optics for astronomy requires thin-film deposition that is precisely fine-tuned so that it will not distort the thin sub-mm substrates. Film of very low stress is required. Alternatively, mirror distortion can be cancelled by precisely balancing the deformation from multiple films. We will present results on metallic film deposition for the lightweight optics under development. These efforts include: low-stress deposition by magnetron sputtering and atomic layer deposition of the metals, balancing of gross deformation with two-layer depositions of opposite stresses and with depositions on both sides of the thin mirrors.

X-ray Microscopic Characterization of Protein Crystals

NASA Technical Reports Server (NTRS)

Hu, Z. W.; Holmes, A.; Thomas, B.R.; Chernov, a. A.; Chu, Y. S.; Lai, B.

2004-01-01

The microscopic mapping of the variation in degree of perfection and in type of defects in entire protein crystals by x-rays may well be a prerequisite for better understanding causes of lattice imperfections, the growth history, and properties of protein crystals. However, x-ray microscopic characterization of bulk protein crystals, in the as-grown state, is frequently more challenging than that of small molecular crystals due to the experimental difficulties arising largely from the unique features possessed by protein crystals. In this presentation, we will illustrate ssme recent activities in employing coherence-based phase contrast x-ray imaging and high-angular-resolution diffraction techniques for mapping microdefects and the degree of perfection of protein crystals, and demonstrate a correlation between crystal perfection, diffraction phenomena., and crystallization conditions. The observed features and phenomena will be discussed in context to gain insight into the nature of defects, nucleation and growth, and the properties of protein crystals.

Airborne particulate matter (PM) filter analysis and modeling by total reflection X-ray fluorescence (TXRF) and X-ray standing wave (XSW).

PubMed

Borgese, L; Salmistraro, M; Gianoncelli, A; Zacco, A; Lucchini, R; Zimmerman, N; Pisani, L; Siviero, G; Depero, L E; Bontempi, E

2012-01-30

This work is presented as an improvement of a recently introduced method for airborne particulate matter (PM) filter analysis [1]. X-ray standing wave (XSW) and total reflection X-ray fluorescence (TXRF) were performed with a new dedicated laboratory instrumentation. The main advantage of performing both XSW and TXRF, is the possibility to distinguish the nature of the sample: if it is a small droplet dry residue, a thin film like or a bulk sample. Another advantage is related to the possibility to select the angle of total reflection to make TXRF measurements. Finally, the possibility to switch the X-ray source allows to measure with more accuracy lighter and heavier elements (with a change in X-ray anode, for example from Mo to Cu). The aim of the present study is to lay the theoretical foundation of the new proposed method for airborne PM filters quantitative analysis improving the accuracy and efficiency of quantification by means of an external standard. The theoretical model presented and discussed demonstrated that airborne PM filters can be considered as thin layers. A set of reference samples is prepared in laboratory and used to obtain a calibration curve. Our results demonstrate that the proposed method for quantitative analysis of air PM filters is affordable and reliable without the necessity to digest filters to obtain quantitative chemical analysis, and that the use of XSW improve the accuracy of TXRF analysis. Copyright © 2011 Elsevier B.V. All rights reserved.

Portable total reflection x-ray fluorescence analysis in the identification of unknown laboratory hazards

DOE Office of Scientific and Technical Information (OSTI.GOV)

Liu, Ying, E-mail: liu.ying.48r@st.kyoto-u.ac.jp; Imashuku, Susumu; Sasaki, Nobuharu

In this study, a portable total reflection x-ray fluorescence (TXRF) spectrometer was used to analyze unknown laboratory hazards that precipitated on exterior surfaces of cooling pipes and fume hood pipes in chemical laboratories. With the aim to examine the accuracy of TXRF analysis for the determination of elemental composition, analytical results were compared with those of wavelength-dispersive x-ray fluorescence spectrometry, scanning electron microscope and energy-dispersive x-ray spectrometry, energy-dispersive x-ray fluorescence spectrometry, inductively coupled plasma atomic emission spectrometry, x-ray diffraction spectrometry (XRD), and x-ray photoelectron spectroscopy (XPS). Detailed comparison of data confirmed that the TXRF method itself was not sufficient tomore » determine all the elements (Z > 11) contained in the samples. In addition, results suggest that XRD should be combined with XPS in order to accurately determine compound composition. This study demonstrates that at least two analytical methods should be used in order to analyze the composition of unknown real samples.« less

The X-ray reflectivity of the AXAF VETA-I optics

NASA Technical Reports Server (NTRS)

Kellogg, E.; Chartas, G.; Graessle, D.; Hughes, J. P.; Van Speybroeck, L.; Zhao, Ping; Weisskopf, M. C.; Elsner, R. F.; O'Dell, S. L.

1993-01-01

The study measures the X-ray reflectivity of the AXAF VETA-I optic and compares it with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. A synchrotron reflectivity measurement with a high-energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample is also reported. Evidence is found for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror, perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 and 10 percent. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff.

Reflectivity Around the Gold M-Edges of X-ray Reflector of the Soft X-Ray Telescope Onboard ASTRO-H

NASA Technical Reports Server (NTRS)

Kurashimaa, Sho; Furuzawa, Akihiro; Sato, Toshiki; Kikuchia, Naomichi; Nakaniwaa, Nozomi; Maeda, Yoshitomo; Ishida, Manabu; Izuka, Ryo; Okajima, Takashi; Mori, Hideyuki;

X-Ray Laser

DTIC Science & Technology

1991-01-31

Reflection in Relativistic Electron Beam Channel Radiation Systems, IEEE Trans. on Plasma Science 16(5), 548 (1988). 3. M. Strauss, P. Amendt, N...Reduced Radiation Losses in a Channeled-Beam X-Ray Laser by Bragg Reflection Coupling, Phys. Rev. A 39(11), 5791 (1989). 6. M. Strauss and N. Rostoker... Radiation Guiding in Channeling Beam X-Ray Laser by Bragg Reflection Coupling, Phys. Rev. A 40(12), 7097 (1989). 91-00870111 llllltl

Testing the Pairs-Reflection Model with X-Ray Spectral Variability and X-Ray Properties of Complete Samples of Radio-Selected BL Lacertae Objects

NASA Astrophysics Data System (ADS)

Urry, C. Megan

1997-01-01

This grant was awarded to Dr. C. Megan Urry of the Space Telescope Science Institute in response to two successful ADP proposals to use archival Ginga and Rosat X-ray data for 'Testing the Pairs-Reflection model with X-Ray Spectral Variability' (in collaboration with Paola Grandi, now at the University of Rome) and 'X-Ray Properties of Complete Samples of Radio-Selected BL Lacertae Objects' (in collaboration with then-graduate student Rita Sambruna, now a post-doc at Goddard Space Flight Center). In addition, post-docs Joseph Pesce and Elena Pian, and graduate student Matthew O'Dowd, have worked on several aspects of these projects. The grant was originally awarded on 3/01/94; this report covers the full period, through May 1997. We have completed our project on the X-ray properties of radio-selected BL Lacs.

Method for spatially modulating X-ray pulses using MEMS-based X-ray optics

DOE Office of Scientific and Technical Information (OSTI.GOV)

Lopez, Daniel; Shenoy, Gopal; Wang, Jin

A method and apparatus are provided for spatially modulating X-rays or X-ray pulses using microelectromechanical systems (MEMS) based X-ray optics. A torsionally-oscillating MEMS micromirror and a method of leveraging the grazing-angle reflection property are provided to modulate X-ray pulses with a high-degree of controllability.

Grazing-incidence coherent x-ray imaging in true reflection geometry

NASA Astrophysics Data System (ADS)

Sun, Tao; Jiang, Zhang; Strzalka, Joseph; Wang, Jin

2012-02-01

The development of the 3^rd and 4^th generation synchrotrons has stimulated extensive research activities in x-ray imaging techniques. Among all, coherent diffractive imaging (CDI) shows great promise, as its resolution is only limited by the wavelength of the source. Most of the CDI work reported thus far used transmission geometry, which however is not suitable for samples on opaque substrates or in which only the surfaces are the regions of interest. Even though two groups have performed CDI experiments (using laser or x-ray) in reflection geometry and succeeded in reconstructing the planar image of the surface, the theoretical underpinnings and analysis approaches of their techniques are essentially identical to transmission CDI. Most importantly, they couldn't obtain the structural information along sample thickness direction. Here, we introduce a reflection CDI technique that works at grazing-incidence geometry. By visualizing Au nanostructures fabricated on Si substrate, we demonstrate that this innovative imaging technique is capable of obtaining both 2D and 3D information of surfaces or buried structures in the samples. In the meanwhile, we will also explain the grazing-incidence-scattering based-algorithm developed for 3D phase retrieval.

Soft x-ray transmission grating spectrometer for X-ray Surveyor and smaller missions with high resolving power

NASA Astrophysics Data System (ADS)

Heilmann, Ralf K.; Bruccoleri, Alexander; Schattenburg, Mark; Kolodziejczak, jeffery; Gaskin, Jessica; O'Dell, Stephen L.

2017-01-01

A number of high priority subjects in astrophysics are addressed by a state-of-the-art soft x-ray grating spectrometer, e.g. the role of Active Galactic Nuclei in galaxy and star formation, characterization of the WHIM and the “missing baryon” problem, characterization of halos around the Milky Way and nearby galaxies, and stellar coronae and surrounding winds and disks. An Explorer-scale, large-area (A > 1,000 cm2), high resolving power (R > 3,000) soft x-ray grating spectrometer is highly feasible based on Critical-Angle Transmission (CAT) grating technology, even for telescopes with angular resolution of 5-10 arcsec. Significantly higher performance could be provided by a CAT grating spectrometer on an X-ray-Surveyor-type mission (A > 4,000 cm2, R > 5,000). CAT gratings combine advantages of blazed reflection gratings (high efficiency, use of higher orders) with those of transmission gratings (low mass, relaxed alignment tolerances and temperature requirements, transparent at higher energies) with minimal mission resource requirements. Blazing is achieved through grazing-incidence reflection off the smooth silicon grating bar sidewalls. Silicon is well matched to the soft x-ray band, and 30% absolute diffraction efficiency has been acheived with clear paths for further improvement. CAT gratings with sidewalls made of high-Z elements allow extension of blazing to higher energies and larger dispersion angles, enabling higher resolving power at shorter wavelengths. X-ray data from CAT gratings coated with a thin layer of platinum using atomic layer deposition demonstrate efficient blazing to higher energies and much larger blaze angles than possible with silicon alone. Measurements of the resolving power of a breadboard CAT grating spectrometer consisting of a Wolter-I slumped-glass focusing optic from GSFC and CAT gratings, taken at the MSFC Stray Light Facility, have demonstrated resolving power > 10,000. Thus currently fabricated CAT gratings are compatible

Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

NASA Astrophysics Data System (ADS)

Streli, C.; Pepponi, G.; Wobrauschek, P.; Jokubonis, C.; Falkenberg, G.; Záray, G.; Broekaert, J.; Fittschen, U.; Peschel, B.

2006-11-01

At the Hamburger Synchrotronstrahlungslabor (HASYLAB), Beamline L, a vacuum chamber for synchrotron radiation-induced total reflection X-ray fluorescence analysis, is now available which can easily be installed using the adjustment components for microanalysis present at this beamline. The detector is now in the final version of a Vortex silicon drift detector with 50-mm 2 active area from Radiant Detector Technologies. With the Ni/C multilayer monochromator set to 17 keV extrapolated detection limits of 8 fg were obtained using the 50-mm 2 silicon drift detector with 1000 s live time on a sample containing 100 pg of Ni. Various applications are presented, especially of samples which are available in very small amounts: As synchrotron radiation-induced total reflection X-ray fluorescence analysis is much more sensitive than tube-excited total reflection X-ray fluorescence analysis, the sampling time of aerosol samples can be diminished, resulting in a more precise time resolution of atmospheric events. Aerosols, directly sampled on Si reflectors in an impactor were investigated. A further application was the determination of contamination elements in a slurry of high-purity Al 2O 3. No digestion is required; the sample is pipetted and dried before analysis. A comparison with laboratory total reflection X-ray fluorescence analysis showed the higher sensitivity of synchrotron radiation-induced total reflection X-ray fluorescence analysis, more contamination elements could be detected. Using the Si-111 crystal monochromator also available at beamline L, XANES measurements to determine the chemical state were performed. This is only possible with lower sensitivity as the flux transmitted by the crystal monochromator is about a factor of 100 lower than that transmitted by the multilayer monochromator. Preliminary results of X-ray absorption near-edge structure measurements for As in xylem sap from cucumber plants fed with As(III) and As(V) are reported. Detection limits

HPHT growth and x-ray characterization of high-quality type IIa diamond.

PubMed

Burns, R C; Chumakov, A I; Connell, S H; Dube, D; Godfried, H P; Hansen, J O; Härtwig, J; Hoszowska, J; Masiello, F; Mkhonza, L; Rebak, M; Rommevaux, A; Setshedi, R; Van Vaerenbergh, P

2009-09-09

The trend in synchrotron radiation (x-rays) is towards higher brilliance. This may lead to a very high power density, of the order of hundreds of watts per square millimetre at the x-ray optical elements. These elements are, typically, windows, polarizers, filters and monochromators. The preferred material for Bragg diffracting optical elements at present is silicon, which can be grown to a very high crystal perfection and workable size as well as rather easily processed to the required surface quality. This allows x-ray optical elements to be built with a sufficient degree of lattice perfection and crystal processing that they may preserve transversal coherence in the x-ray beam. This is important for the new techniques which include phase-sensitive imaging experiments like holo-tomography, x-ray photon correlation spectroscopy, coherent diffraction imaging and nanofocusing. Diamond has a lower absorption coefficient than silicon, a better thermal conductivity and lower thermal expansion coefficient which would make it the preferred material if the crystal perfection (bulk and surface) could be improved. Synthetic HPHT-grown (high pressure, high temperature) type Ib material can readily be produced in the necessary sizes of 4-8 mm square and with a nitrogen content of typically a few hundred parts per million. This material has applications in the less demanding roles such as phase plates: however, in a coherence-preserving beamline, where all elements must be of the same high quality, its quality is far from sufficient. Advances in HPHT synthesis methods have allowed the growth of type IIa diamond crystals of the same size as type Ib, but with substantially lower nitrogen content. Characterization of this high purity type IIa material has been carried out with the result that the crystalline (bulk) perfection of some of the HPHT-grown materials is approaching the quality required for the more demanding applications such as imaging applications and imaging

Observation of femtosecond X-ray interactions with matter using an X-ray–X-ray pump–probe scheme

PubMed Central

Inoue, Ichiro; Inubushi, Yuichi; Sato, Takahiro; Tono, Kensuke; Katayama, Tetsuo; Kameshima, Takashi; Ogawa, Kanade; Togashi, Tadashi; Owada, Shigeki; Amemiya, Yoshiyuki; Tanaka, Takashi; Hara, Toru

2016-01-01

Resolution in the X-ray structure determination of noncrystalline samples has been limited to several tens of nanometers, because deep X-ray irradiation required for enhanced resolution causes radiation damage to samples. However, theoretical studies predict that the femtosecond (fs) durations of X-ray free-electron laser (XFEL) pulses make it possible to record scattering signals before the initiation of X-ray damage processes; thus, an ultraintense X-ray beam can be used beyond the conventional limit of radiation dose. Here, we verify this scenario by directly observing femtosecond X-ray damage processes in diamond irradiated with extraordinarily intense (∼1019 W/cm2) XFEL pulses. An X-ray pump–probe diffraction scheme was developed in this study; tightly focused double–5-fs XFEL pulses with time separations ranging from sub-fs to 80 fs were used to excite (i.e., pump) the diamond and characterize (i.e., probe) the temporal changes of the crystalline structures through Bragg reflection. It was found that the pump and probe diffraction intensities remain almost constant for shorter time separations of the double pulse, whereas the probe diffraction intensities decreased after 20 fs following pump pulse irradiation due to the X-ray–induced atomic displacement. This result indicates that sub-10-fs XFEL pulses enable conductions of damageless structural determinations and supports the validity of the theoretical predictions of ultraintense X-ray–matter interactions. The X-ray pump–probe scheme demonstrated here would be effective for understanding ultraintense X-ray–matter interactions, which will greatly stimulate advanced XFEL applications, such as atomic structure determination of a single molecule and generation of exotic matters with high energy densities. PMID:26811449

Prediction of Ba, Co and Ni for tropical soils using diffuse reflectance spectroscopy and X-ray fluorescence spectroscopy

NASA Astrophysics Data System (ADS)

Arantes Camargo, Livia; Marques Júnior, José; Reynaldo Ferracciú Alleoni, Luís; Tadeu Pereira, Gener; De Bortoli Teixeira, Daniel; Santos Rabelo de Souza Bahia, Angélica

2017-04-01

Environmental impact assessments may be assisted by spatial characterization of potentially toxic elements (PTEs). Diffuse reflectance spectroscopy (DRS) and X-ray fluorescence spectroscopy (XRF) are rapid, non-destructive, low-cost, prediction tools for a simultaneous characterization of different soil attributes. Although low concentrations of PTEs might preclude the observation of spectral features, their contents can be predicted using spectroscopy by exploring the existing relationship between the PTEs and soil attributes with spectral features. This study aimed to evaluate, in three geomorphic surfaces of Oxisols, the capacity for predicting PTEs (Ba, Co, and Ni) and their spatial variability by means of diffuse reflectance spectroscopy (DRS) and X-ray fluorescence spectroscopy (XRF). For that, soil samples were collected from three geomorphic surfaces and analyzed for chemical, physical, and mineralogical properties, and then analyzed in DRS (visible + near infrared - VIS+NIR and medium infrared - MIR) and XRF equipment. PTE prediction models were calibrated using partial least squares regression (PLSR). PTE spatial distribution maps were built using the values calculated by the calibrated models that reached the best accuracy using geostatistics. PTE prediction models were satisfactorily calibrated using MIR DRS for Ba, and Co (residual prediction deviation - RPD > 3.0), Vis DRS for Ni (RPD > 2.0) and FRX for all the studied PTEs (RPD > 1.8). DRS- and XRF-predicted values allowed the characterization and the understanding of spatial variability of the studied PTEs.

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

DOE Office of Scientific and Technical Information (OSTI.GOV)

Patommel, Jens; Klare, Susanne; Hoppe, Robert

In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection, the concept of adiabatically focusing refractive lenses was proposed to overcome this limit. Here, we present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10 –3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

DOE PAGES

Patommel, Jens; Klare, Susanne; Hoppe, Robert; ...

2017-03-06

In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection, the concept of adiabatically focusing refractive lenses was proposed to overcome this limit. Here, we present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10 –3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.

X-ray resonant magnetic scattering ellipsometer

DOE Office of Scientific and Technical Information (OSTI.GOV)

Xu, Z.; Randall, K.J.; Gluskin, E.

1996-09-01

It is very difficult to characterize the polarization of a synchrotron radiation source in the soft and/or intermediate x-ray energy region particularly from 1 to 2 keV. Conventional multilayer mirror or single-crystal polarimeters do not work over this energy region because their throughput (the reflectivities combined with the phase shift) becomes insignificant. In this paper, we present a new ellipsometer scheme that is able to fully characterize the polarization of synchrotron radiation sources in this energy region. It is based on the dichroic x-ray resonant ferromagnetic scattering that yields information on both the polarization of the x-ray and the materialmore » (element specific) dielectric-constant tensor [C.-C. Kao {ital et} {ital al}., Phys. Rev. B {bold 50}, 9599 (1994)] due to the interband ferromagnetic Kerr effect [B.R. Cooper, Phys. Rev. A {bold 139}, 1504 (1965)]. {copyright} {ital 1996 American Institute of Physics.}« less

Depth resolved compositional analysis of aluminium oxide thin film using non-destructive soft x-ray reflectivity technique

NASA Astrophysics Data System (ADS)

Sinha, Mangalika; Modi, Mohammed H.

2017-10-01

In-depth compositional analysis of 240 Å thick aluminium oxide thin film has been carried out using soft x-ray reflectivity (SXR) and x-ray photoelectron spectroscopy technique (XPS). The compositional details of the film is estimated by modelling the optical index profile obtained from the SXR measurements over 60-200 Å wavelength region. The SXR measurements are carried out at Indus-1 reflectivity beamline. The method suggests that the principal film region is comprised of Al2O3 and AlOx (x = 1.6) phases whereas the interface region comprised of SiO2 and AlOx (x = 1.6) mixture. The soft x-ray reflectivity technique combined with XPS measurements explains the compositional details of principal layer. Since the interface region cannot be analyzed with the XPS technique in a non-destructive manner in such a case the SXR technique is a powerful tool for nondestructive compositional analysis of interface region.

X-Ray Reflected Spectra from Accretion Disk Models. II. Diagnostic Tools for X-Ray Observations

NASA Technical Reports Server (NTRS)

Garcia, J.; Kallman, T. R.; Mushotzky, R. F.

2011-01-01

We present a comprehensive study of the emission spectra from accreting sources. We use our new reflection code to compute the reflected spectra from an accretion disk illuminated by X-rays. This set of models covers different values of ionization parameter, solar iron abundance and photon index for the illuminating spectrum. These models also include the most complete and recent atomic data for the inner-shell of the iron and oxygen isonuclear sequences. We concentrate our analysis to the 2 - 10 keV energy region, and in particular to the iron K-shell emission lines. We show the dependency of the equivalent width (EW) of the Fe Ka with the ionization parameter. The maximum value of the EW is approx. 800 eV for models with log Epsilon approx. 1.5, and decreases monotonically as Epsilon increases. For lower values of Epsilon the Fe K(alpha) EW decreases to a minimum near log Epsilon approx. 0.8. We produce simulated CCD observations based on our reflection models. For low ionized, reflection dominated cases, the 2 -10 keV energy region shows a very broad, curving continuum that cannot be represented by a simple power-law. We show that in addition to the Fe K-shell emission, there are other prominent features such as the Si and S L(alpha) lines, a blend of Ar VIII-XI lines, and the Ca x K(alpha) line. In some cases the S xv blends with the He-like Si RRC producing a broad feature that cannot be reproduced by a simple Gaussian profile. This could be used as a signature of reflection.

Large-area soft x-ray projection lithography using multilayer mirrors structured by RIE

NASA Astrophysics Data System (ADS)

Rahn, Steffen; Kloidt, Andreas; Kleineberg, Ulf; Schmiedeskamp, Bernt; Kadel, Klaus; Schomburg, Werner K.; Hormes, F. J.; Heinzmann, Ulrich

1993-01-01

SXPL (soft X-ray projection lithography) is one of the most promising applications of X-ray reflecting optics using multilayer mirrors. Within our collaboration, such multilayer mirrors were fabricated, characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors were produced by electron beam evaporation in UHV under thermal treatment with an in-situ X-ray controlled thickness in the region of 2d equals 14 nm. The reflectivities measured at normal incidence reached up to 54%. Various surface analysis techniques have been applied in order to characterize and optimize the X-ray mirrors. The multilayers were patterned by reactive ion etching (RIE) with CF(subscript 4), using a photoresist as the etch mask, thus producing X-ray reflection masks. The masks were tested in the synchrotron radiation laboratory of the electron accelerator ELSA at the Physikalisches Institut of Bonn University. A double crystal X-ray monochromator was modified so as to allow about 0.5 cm(superscript 2) of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto the resist (Hoechst AZ PF 514), which was mounted at an average distance of about 7 mm. In the first test-experiments, structure sizes down to 8 micrometers were nicely reproduced over the whole of the exposed area. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

Characterization of X-ray Lobster Optics with a Hybrid CMOS sensor

NASA Astrophysics Data System (ADS)

Chattopadhyay, Tanmoy; Falcone, Abraham; Burrows, David N.; Bray, Evan; McQuaide, Maria; Kern, Matthew; Wages, Mitchell; Hull, Samuel; Inneman, Adolf; Hudec, Rene; Stehlikova, Veronika

2018-01-01

X-ray lobster optics provide a unique way to focus X-rays onto a small focal plane imager with wide field of view imaging. Such an instrument with angular resolution of a few arcminutes can be used to study GRB afterglows, as well as the variability and spectroscopic characteristics for various astrophysical objects. At Penn State University, we have characterized a lobster optic with an H1RG X-Ray hybrid CMOS detector (100 μm thick Silicon with 18 μm pixel size). The light-weight compact lobster optic with a 25 cm focal length provides two dimensional imaging with ~25 cm2 effective area at 2 keV. We utilize a 47 meter long X-ray beam line at Penn state University to do our experiments where we characterize the overall effective area of the instrument at 1.5 - 8 keV for both on-axis and off-axis angles. In this presentation, we will describe the characterization test stand and methods, as well as the detailed results. While this is simply a proof-of-concept experiment, such an instrument with significant collecting area can be explored for future rocket or CubeSat experiments.

Quantitative X-ray Differential Interference Contrast Microscopy

NASA Astrophysics Data System (ADS)

Nakamura, Takashi

. A new illumination apparatus required for the transfer function analysis under partially coherent illumination is also proposed. Such a characterization is essential for a proper selection of DIC optics for various transparent samples under study. Finally, optical elements used for x-ray DIC microscopy are highly absorptive and high brilliance x-ray sources such as synchrotrons are generally needed for image contrast. To extend the use of x-ray DIC microscopy to a wider variety of applications, a high efficiency large numerical aperture optical element consisting of high reflective Bragg reflectors is proposed. Using Bragg reflectors, which have 70% ˜99% reflectivity at extreme ultraviolet and soft x-rays for all angles of glancing incidence, the first order focusing efficiency is expected to increase by ˜ 8 times compared to that of a typical Fresnel zone-plate. This thesis contributes to current nanoscale x-ray phase contrast imaging research and provides new insights for biological, material, and magnetic sciences

Optics for coherent X-ray applications

PubMed Central

Yabashi, Makina; Tono, Kensuke; Mimura, Hidekazu; Matsuyama, Satoshi; Yamauchi, Kazuto; Tanaka, Takashi; Tanaka, Hitoshi; Tamasaku, Kenji; Ohashi, Haruhiko; Goto, Shunji; Ishikawa, Tetsuya

2014-01-01

Developments of X-ray optics for full utilization of diffraction-limited storage rings (DLSRs) are presented. The expected performance of DLSRs is introduced using the design parameters of SPring-8 II. To develop optical elements applicable to manipulation of coherent X-rays, advanced technologies on precise processing and metrology were invented. With propagation-based coherent X-rays at the 1 km beamline of SPring-8, a beryllium window fabricated with the physical-vapour-deposition method was found to have ideal speckle-free properties. The elastic emission machining method was utilized for developing reflective mirrors without distortion of the wavefronts. The method was further applied to production of diffraction-limited focusing mirrors generating the smallest spot size in the sub-10 nm regime. To enable production of ultra-intense nanobeams at DLSRs, a low-vibration cooling system for a high-heat-load monochromator and advanced diagnostic systems to characterize X-ray beam properties precisely were developed. Finally, new experimental schemes for combinative nano-analysis and spectroscopy realised with novel X-ray optics are discussed. PMID:25177986

Optics for coherent X-ray applications.

PubMed

Yabashi, Makina; Tono, Kensuke; Mimura, Hidekazu; Matsuyama, Satoshi; Yamauchi, Kazuto; Tanaka, Takashi; Tanaka, Hitoshi; Tamasaku, Kenji; Ohashi, Haruhiko; Goto, Shunji; Ishikawa, Tetsuya

2014-09-01

Developments of X-ray optics for full utilization of diffraction-limited storage rings (DLSRs) are presented. The expected performance of DLSRs is introduced using the design parameters of SPring-8 II. To develop optical elements applicable to manipulation of coherent X-rays, advanced technologies on precise processing and metrology were invented. With propagation-based coherent X-rays at the 1 km beamline of SPring-8, a beryllium window fabricated with the physical-vapour-deposition method was found to have ideal speckle-free properties. The elastic emission machining method was utilized for developing reflective mirrors without distortion of the wavefronts. The method was further applied to production of diffraction-limited focusing mirrors generating the smallest spot size in the sub-10 nm regime. To enable production of ultra-intense nanobeams at DLSRs, a low-vibration cooling system for a high-heat-load monochromator and advanced diagnostic systems to characterize X-ray beam properties precisely were developed. Finally, new experimental schemes for combinative nano-analysis and spectroscopy realised with novel X-ray optics are discussed.

Effect of surface roughness and subsurface damage on grazing-incidence x-ray scattering and specular reflectance.

PubMed

Lodha, G S; Yamashita, K; Kunieda, H; Tawara, Y; Yu, J; Namba, Y; Bennett, J M

1998-08-01

Grazing-incidence specular reflectance and near-specular scattering were measured at Al-K(alpha) (1.486-keV, 8.34-?) radiation on uncoated dielectric substrates whose surface topography had been measured with a scanning probe microscope and a mechanical profiler. Grazing-incidence specular reflectance was also measured on selected substrates at the Cu-K(alpha) (8.047-keV, 1.54-?) wavelength. Substrates included superpolished and conventionally polished fused silica; SiO(2) wafers; superpolished and precision-ground Zerodur; conventionally polished, float-polished, and precision-ground BK-7 glass; and superpolished and precision-ground silicon carbide. Roughnesses derived from x-ray specular reflectance and scattering measurements were in good agreement with topographic roughness values measured with a scanning probe microscope (atomic force microscope) and a mechanical profiler that included similar ranges of surface spatial wavelengths. The specular reflectance was also found to be sensitive to the density of polished surface layers and subsurface damage down to the penetration depth of the x rays. Density gradients and subsurface damage were found in the superpolished fused-silica and precision-ground Zerodur samples. These results suggest that one can nondestructively evaluate subsurface damage in transparent materials using grazing-incidence x-ray specular reflectance in the 1.5-8-keV range.

Characterizing X-Ray and Radio Emission in the Black Hole X-Ray Binary V404 Cygni During Quiescence

NASA Technical Reports Server (NTRS)

Rana, Vikram; Loh, Alan; Corbel, Stephane; Tomsick, John A.; Chakrabarty, Deepto; Walton, Dominic J.; Barret, Didier; Boggs, Steven E.; Christensen, Finn E.; Craig, William;

Alternative designs for space x-ray telescopes

NASA Astrophysics Data System (ADS)

Hudec, R.; Pína, L.; Maršíková, Veronika; Černá, Daniela; Inneman, A.; Tichý, V.

2017-11-01

The X-ray optics is a key element of space X-ray telescopes, as well as other X-ray imaging instruments. The grazing incidence X-ray lenses represent the important class of X-ray optics. Most of grazing incidence (reflective) X-ray imaging systems used in astronomy but also in other (laboratory) applications are based on the Wolter 1 (or modified) arrangement. But there are also other designs and configurations proposed, used and considered for future applications both in space and in laboratory. The Kirkpatrick-Baez (K-B) lenses as well as various types of Lobster-Eye optics and MCP/Micropore optics serve as an example. Analogously to Wolter lenses, the X-rays are mostly reflected twice in these systems to create focal images. Various future projects in X-ray astronomy and astrophysics will require large segments with multiple thin shells or foils. The large Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All related space projects will require high quality and light segmented shells (bent or flat foils) with high X-ray reflectivity and excellent mechanical stability. The Multi Foil Optics (MFO) approach represent a promising alternative for both LE and K-B X-ray optical modules. Several types of reflecting substrates may be considered for these applications, with emphasis on thin float glass sheets and, more recently, high quality silicon wafers. This confirms the importance of non-Wolter X-ray optics designs for the future. The alternative designs require novel reflective substrates which are also discussed in the paper.

Characterization of X80 and X100 Microalloyed Pipeline Steel Using Quantitative X-ray Diffraction

NASA Astrophysics Data System (ADS)

Wiskel, J. B.; Li, X.; Ivey, D. G.; Henein, H.

2018-06-01

Quantitative X-ray diffraction characterization of four (4) X80 and three (3) X100 microalloyed steels was undertaken. The effect of through-thickness position, processing parameters, and composition on the measured crystallite size, microstrain, and J index (relative magnitude of crystallographic texture) was determined. Microstructure analysis using optical microscopy, scanning electron microscopy, transmission electron microscopy, and electron-backscattered diffraction was also undertaken. The measured value of microstrain increased with increasing alloy content and decreasing cooling interrupt temperature. Microstructural features corresponding to crystallite size in the X80 steels were both above and below the detection limit for quantitative X-ray diffraction. The X100 steels consistently exhibited microstructure features below the crystallite size detection limit. The yield stress of each steel increased with increasing microstrain. The increase in microstrain from X80 to X100 is also associated with a change in microstructure from predominantly polygonal ferrite to bainitic ferrite.

Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations

DOE PAGES

Mei, A. B.; Hellman, O.; Schlepuetz, C. M.; ...

2015-11-03

Synchrotron reflection x-ray thermal diffuse scattering (TDS) measurements, rather than previously reported transmission TDS, are carried out at room temperature and analyzed using a formalism based upon second-order interatomic force constants and long-range Coulomb interactions to obtain quantitative determinations of MgO phonon dispersion relations (h) over bar omega(j) (q), phonon densities of states g((h) over bar omega), and isochoric temperature-dependent vibrational heat capacities c v (T). We use MgO as a model system for investigating reflection TDS due to its harmonic behavior as well as its mechanical and dynamic stability. Resulting phonon dispersion relations and densities of states are foundmore » to be in good agreement with independent reports from inelastic neutron and x-ray scattering experiments. Temperature-dependent isochoric heat capacities c v (T), computed within the harmonic approximation from (h) over bar omega(j) (q) values, increase with temperature from 0.4 x 10 -4 eV/atom K at 100 K to 1.4 x 10 -4 eV/atom K at 200 K and 1.9 x 10 -4 eV/atom K at 300 K, in excellent agreement with isobaric heat capacity values c p (T) between 4 and 300 K. We anticipate that the experimental approach developed here will be valuable for determining vibrational properties of heteroepitaxial thin films since the use of grazing-incidence (θ ≲ θ c where θ c is the density-dependent critical angle) allows selective tuning of x-ray penetration depths to ≲ 10 nm.« less

X-ray Crystallography Facility

NASA Technical Reports Server (NTRS)

2000-01-01

Edward Snell, a National Research Council research fellow at NASA's Marshall Space Flight Center (MSFC), prepares a protein crystal for analysis by x-ray crystallography as part of NASA's structural biology program. The small, individual crystals are bombarded with x-rays to produce diffraction patterns, a map of the intensity of the x-rays as they reflect through the crystal.

[Development of X-ray Reflection Grating Technology for the Constellation-X Mission

NASA Technical Reports Server (NTRS)

Schattenburg, Mark L.

2005-01-01

This Grant supports MIT technology development of x-ray reflection gratings for the Constellation-X Reflection Grating Spectrometer (RGS). Since the start of the Grant MIT has extended its previously-developed patterning and super-smooth, blazed grating fabrication technology to ten-times smaller grating periods and ten-times larger blaze angles to demonstrate feasibility and performance in the off-plane grating geometry. In the past year we have focused our efforts on extending our Nanoruler grating fabrication tool to enable it to perform variable-period scanning-beam interference lithography (VP-SBIL). This new capability required extensive optical and mechanical improvements to the system. The design phase of this work is largely completed and key components are now on order and assembly has begun. Over the next several months the new VP-SBIL Nanoruler system will be completed and testing begun. We have also demonstrated a new technique for patterning gratings using the Nanoruler called Doppler mode, which will be important for patterning the radial groove gratings for the RGS using the new VP-SBIL system. Flat and thin grating substrates will be critical for the RGS. In the last year we demonstrated a new technique for flattening thin substrates using magneto-rheologic fluid polishing (MRF) and achieved 2 arcsecond flatness with a 0.5 mm-thick substrate-a world's record. This meets the Con X requirement for grating substrate flatness.

Analysis of coke beverages by total-reflection X-ray fluorescence

NASA Astrophysics Data System (ADS)

Fernández-Ruiz, Ramón; von Bohlen, Alex; Friedrich K, E. Josue; Redrejo, M. J.

2018-07-01

The influence of the organic content, sample preparation process and the morphology of the depositions of two types of Coke beverage, traditional and light Coke, have been investigated by mean of Total-reflection X-ray Fluorescence (TXRF) spectrometry. Strong distortions of the nominal concentration values, up to 128% for P, have been detected in the analysis of traditional Coke by different preparation methods. These differences have been correlated with the edge X-ray energies of the elements analyzed being more pronounced for the lighter elements. The influence of the organic content (mainly sugar) was evaluated comparing traditional and light Coke analytical TXRF results. Three sample preparation methods have been evaluated as follows: direct TXRF analysis of the sample only adding internal standard, TXRF analysis after open vessel acid digestion and TXRF analysis after high pressure and temperature microwave-assisted acid digestion. Strong correlations were detected between quantitative results, methods of preparation and energies of the X-ray absorption edges of quantified elements. In this way, a decay behavior for the concentration differences between preparation methods and the energies of the X-ray absorption edges of each element were observed. The observed behaviors were modeled with exponential decay functions obtaining R2 correlation coefficients from 0.989 to 0.992. The strong absorption effect observed, and even possible matrix effect, can be explained by the inherent high organic content of the evaluated samples and also by the morphology and average thickness of the TXRF depositions observed. As main conclusion of this work, the analysis of light elements in samples with high organic content by TXRF, i.e. medical, biological, food or any other organic matrixes should be taken carefully. In any case, the direct analysis is not recommended and a previous microwave-assisted acid digestion, or similar, is mandatory, for the correct elemental

Application of the Total Reflection X-ray Fluorescence technique to trace elements determination in tobacco

NASA Astrophysics Data System (ADS)

Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

2008-12-01

Many studies have identified an important number of toxic elements along with organic carcinogen molecules and radioactive isotopes in tobacco. In this work we have analyzed by Total Reflection X-Ray Fluorescence 9 brands of cigarettes being manufactured and distributed in the Mexican market. Two National Institute of Standards and Technology standards and a blank were equally treated at the same time. Results show the presence of some toxic elements such as Pb and Ni. These results are compared with available data for some foreign brands, while their implications for health are discussed. It can be confirmed that the Total Reflection X-Ray Fluorescence method provides precise (reproducible) and accuracy (trueness) data for 15 elements concentration in tobacco samples.

X-ray View of Four High-Luminosity Swift-BAT AGN: Unveiling Obscuration and Reflection with Suzaku

NASA Technical Reports Server (NTRS)

Fiorettil, V.; Angelini, L.; Mushotzky, R. F.; Koss, M.; Malaguti, G.

2013-01-01

Aims. A complete census of obscured Active Galactic Nuclei (AGN) is necessary to reveal the history of the super massive black hole (SMBH) growth and galaxy evolution in the Universe given the complex feedback processes and the fact that much of this growth occurs in an obscured phase. In this context, hard X-ray surveys and dedicated follow-up observations represent a unique tool for selecting highly absorbed AGN and for characterizing the obscuring matter surrounding the SMBH. Here we focus on the absorption and reflection occurring in highly luminous, quasar-like AGN, to study the relation between the geometry of the absorbing matter and the AGN nature (e.g. X-ray, optical, and radio properties), and to help to determine the column density dependency on the AGN luminosity. Methods. The Swift/BAT nine-month survey observed 153 AGN, all with ultra-hard X-ray BAT fluxes in excess of 10(exp -11) erg per square centimeter and an average redshift of 0.03. Among them, four of the most luminous BAT AGN (44.73 less than LogLBAT less than 45.31) were selected as targets of Suzaku follow-up observations: J2246.0+3941 (3C 452), J0407.4+0339 (3C 105), J0318.7+6828, and J0918.5+0425. The column density, scattered/reflected emission, the properties of the Fe K line, and a possible variability are fully analyzed. For the latter, the spectral properties from Chandra, XMM-Newton and Swift/XRT public observations were compared with the present Suzaku analysis, adding an original spectral analysis when non was available from the literature. Results. Of our sample, 3C 452 is the only certain Compton-thick AGN candidate because of i) the high absorption (N(sub H) approximately 4 × 10(exp 23) per square centimeter) and strong Compton reflection; ii) the lack of variability; iii) the "buried" nature, i.e. the low scattering fraction (less than 0.5%) and the extremely low relative [OIII] luminosity. In contrast 3C 105 is not reflection-dominated, despite the comparable column density

Characterization and development of an event-driven hybrid CMOS x-ray detector

NASA Astrophysics Data System (ADS)

Griffith, Christopher

2015-06-01

Hybrid CMOS detectors (HCD) have provided great benefit to the infrared and optical fields of astronomy, and they are poised to do the same for X-ray astronomy. Infrared HCDs have already flown on the Hubble Space Telescope and the Wide-Field Infrared Survey Explorer (WISE) mission and are slated to fly on the James Webb Space Telescope (JWST). Hybrid CMOS X-ray detectors offer low susceptibility to radiation damage, low power consumption, and fast readout time to avoid pile-up. The fast readout time is necessary for future high throughput X-ray missions. The Speedster-EXD X-ray HCD presented in this dissertation offers new in-pixel features and reduces known noise sources seen on previous generation HCDs. The Speedster-EXD detector makes a great step forward in the development of these detectors for future space missions. This dissertation begins with an overview of future X-ray space mission concepts and their detector requirements. The background on the physics of semiconductor devices and an explanation of the detection of X-rays with these devices will be discussed followed by a discussion on CCDs and CMOS detectors. Next, hybrid CMOS X-ray detectors will be explained including their advantages and disadvantages. The Speedster-EXD detector and its new features will be outlined including its ability to only read out pixels which contain X-ray events. Test stand design and construction for the Speedster-EXD detector is outlined and the characterization of each parameter on two Speedster-EXD detectors is detailed including read noise, dark current, interpixel capacitance crosstalk (IPC), and energy resolution. Gain variation is also characterized, and a Monte Carlo simulation of its impact on energy resolution is described. This analysis shows that its effect can be successfully nullified with proper calibration, which would be important for a flight mission. Appendix B contains a study of the extreme tidal disruption event, Swift J1644+57, to search for

Characterization results from several commercial soft X-ray streak cameras

NASA Astrophysics Data System (ADS)

Stradling, G. L.; Studebaker, J. K.; Cavailler, C.; Launspach, J.; Planes, J.

The spatio-temporal performance of four soft X-ray streak cameras has been characterized. The objective in evaluating the performance capability of these instruments is to enable us to optimize experiment designs, to encourage quantitative analysis of streak data and to educate the ultra high speed photography and photonics community about the X-ray detector performance which is available. These measurements have been made collaboratively over the space of two years at the Forge pulsed X-ray source at Los Alamos and at the Ketjak laser facility an CEA Limeil-Valenton. The X-ray pulse lengths used for these measurements at these facilities were 150 psec and 50 psec respectively. The results are presented as dynamically-measured modulation transfer functions. Limiting temporal resolution values were also calculated. Emphasis is placed upon shot noise statistical limitations in the analysis of the data. Space charge repulsion in the streak tube limits the peak flux at ultra short experiments duration times. This limit results in a reduction of total signal and a decrease in signal to no ise ratio in the streak image. The four cameras perform well with 20 1p/mm resolution discernable in data from the French C650X, the Hadland X-Chron 540 and the Hamamatsu C1936X streak cameras. The Kentech X-ray streak camera has lower modulation and does not resolve below 10 1p/mm but has a longer photocathode.

Development and production of a multilayer-coated x-ray reflecting stack for the Athena mission

NASA Astrophysics Data System (ADS)

Massahi, S.; Ferreira, D. D. M.; Christensen, F. E.; Shortt, B.; Girou, D. A.; Collon, M.; Landgraf, B.; Barriere, N.; Krumrey, M.; Cibik, L.; Schreiber, S.

2016-07-01

The Advanced Telescope for High-Energy Astrophysics, Athena, selected as the European Space Agency's second large-mission, is based on the novel Silicon Pore Optics X-ray mirror technology. DTU Space has been working for several years on the development of multilayer coatings on the Silicon Pore Optics in an effort to optimize the throughput of the Athena optics. A linearly graded Ir/B4C multilayer has been deposited on the mirrors, via the direct current magnetron sputtering technique, at DTU Space. This specific multilayer, has through simulations, been demonstrated to produce the highest reflectivity at 6 keV, which is a goal for the scientific objectives of the mission. A critical aspect of the coating process concerns the use of photolithography techniques upon which we will present the most recent developments in particular related to the cleanliness of the plates. Experiments regarding the lift-off and stacking of the mirrors have been performed and the results obtained will be presented. Furthermore, characterization of the deposited thin-films was performed with X-ray reflectometry at DTU Space and in the laboratory of the Physikalisch-Technische Bundesanstalt at the synchrotron radiation facility BESSY II.

Characterization of Beryllium Windows Using Coherent X-rays at 1-km Beamline

DOE Office of Scientific and Technical Information (OSTI.GOV)

Goto, Shunji; Yabashi, Makina; Takahashi, Sunao

2004-05-12

Beryllium windows were characterized using coherent x-rays at the one-kilometer beamline of SPring-8. Non-uniformity of transmission x-ray images is largely due to Fresnel diffraction from deficiencies such as surface pits with diameter of order of one micron to ten microns, having no correlation with averaged surface roughness measured with an optical profilometer.

A mirror for lab-based quasi-monochromatic parallel x-rays

NASA Astrophysics Data System (ADS)

Nguyen, Thanhhai; Lu, Xun; Lee, Chang Jun; Jung, Jin-Ho; Jin, Gye-Hwan; Kim, Sung Youb; Jeon, Insu

2014-09-01

A multilayered parabolic mirror with six W/Al bilayers was designed and fabricated to generate monochromatic parallel x-rays using a lab-based x-ray source. Using this mirror, curved bright bands were obtained in x-ray images as reflected x-rays. The parallelism of the reflected x-rays was investigated using the shape of the bands. The intensity and monochromatic characteristics of the reflected x-rays were evaluated through measurements of the x-ray spectra in the band. High intensity, nearly monochromatic, and parallel x-rays, which can be used for high resolution x-ray microscopes and local radiation therapy systems, were obtained.

In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity

DOE PAGES

Cao, Chuntian; Steinrück, Hans-Georg; Shyam, Badri; ...

2016-10-26

Surface sensitive X-ray reflectivity (XRR) measurements were performed to investigate the electrochemical lithiation of a native oxide terminated single crystalline silicon (100) electrode in real time during the first galvanostatic discharge cycle. This allows us to gain nanoscale, mechanistic insight into the lithiation of Si and the formation of the solid electrolyte interphase (SEI). We describe an electrochemistry cell specifically designed for in situ XRR studies and have determined the evolution of the electron density profile of the lithiated Si layer (Li xSi) and the SEI layer with subnanometer resolution. We propose a three-stage lithiation mechanism with a reaction limited,more » layer-by-layer lithiation of the Si at the Li xSi/Si interface.« less

Characterizing X-ray Sources in the Rich Open Cluster NGC 7789 Using XMM-Newton

NASA Astrophysics Data System (ADS)

Farner, William; Pooley, David

2018-01-01

It is well established that globular clusters exhibit a correlation between their population of exotic binaries and their rate of stellar encounters, but little work has been done to characterize this relationship in rich open clusters. X-ray observations are the most efficient means to find various types of close binaries, and optical (and radio) identifications can provide secure source classifications. We report on an observation of the rich open cluster NGC 7789 using the XMM-Newton observatory. We present the X-ray and optical imaging data, source lists, and preliminary characterization of the sources based on their X-ray and multiwavelength properties.

Analysis of Ti and TiO2 nanolayers by total reflection X-ray photoelectron spectroscopy

NASA Astrophysics Data System (ADS)

Kubala-Kukuś, A.; Banaś, D.; Stabrawa, I.; Szary, K.; Sobota, D.; Majewska, U.; Wudarczyk-Moćko, J.; Braziewicz, J.; Pajek, M.

2018-07-01

Total reflection X-ray photoelectron spectroscopy (TRXPS) is applied in the analysis of Ti and TiO2 nanolayers deposited on silicon and silicon dioxide substrates. The idea of application of total-reflection phenomenon for exciting X-ray used in the XPS technique is briefly discussed. The experimental setup and measurement conditions for the studied Ti and TiO2 layers are presented. The XPS spectra were registered both for the non-total and total reflection regimes. The survey spectra and C1s, N1s, Ti2p and O1s photoelectron peaks are shown. For energy calibration, the position of C1s photoelectron peak was applied (C-C component, binding energy 284.8 eV). The peak to background ratios are discussed as regards the dependence of the excitation angle. An increase of this ratio for the glancing angle 1°, being below critical angle of the X-ray beam and sample material, results in an improvement of XPS detection limit by factor up to 2. In the case of the Ti nanolayer, additionally, the thickness of the overlayer TiO2 is determined. As an example of applying the TRXPS technique, the analysis of Ti nanolayers implanted by highly charged Xe35+ ions of 280 keV energy is discussed. The Xe3d and O1s photoelectron peaks are presented and discussed.

Characterization of aluminum nitride based films with high resolution X-ray fluorescence spectroscopy

NASA Astrophysics Data System (ADS)

Anagnostopoulos, D. F.; Siozios, A.; Patsalas, P.

2018-02-01

X-ray fluorescence spectra of Al based films are measured, using a lab-scale wavelength dispersive flat crystal spectrometer. Various structures of AlN films were studied, like single layered, capped, stratified, nanostructured, crystalline, or amorphous. By optimizing the set-up for enhanced energy resolution and detection efficiency, the measured line shapes of Κα, Kβ, and KLL radiative Auger transitions are shown to be adequately detailed to allow chemical characterization. The chemistry identification is based on the pattern comparison of the emitted line shape from the chemically unknown film and the reference line shapes from standard materials, recorded under identical experimental conditions. The ultimate strength of lab-scale high resolution X-ray fluorescence spectroscopy on film analysis is verified, in cases that ordinary applied techniques like X-ray photoelectron and X-ray diffraction fail, while the characterization refers to the non-destructive determination of the bulk properties of the film and not to its surface, as the probed depth is in the micrometer range.

Ray-trace analysis of glancing-incidence X-ray optical systems

NASA Technical Reports Server (NTRS)

Foreman, J. W., Jr.; Cardone, J. M.

1976-01-01

The results of a ray-trace analysis of several glancing-incidence X-ray optical systems are presented. The object of the study was threefold. First, the vignetting characteristics of the S-056 X-ray telescope were calculated using experimental data to determine mirror reflectivities. Second, a small Wolter Type I X-ray telescope intended for possible use in the Geostationary Operational Environmental Satellite program was designed and ray traced. Finally, a ray-trace program was developed for a Wolter-Schwarzschild X-ray telescope.

Evaluation of the soft x-ray reflectivity of micropore optics using anisotropic wet etching of silicon wafers

DOE Office of Scientific and Technical Information (OSTI.GOV)

Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Koshiishi, Masaki

2010-02-20

The x-ray reflectivity of an ultralightweight and low-cost x-ray optic using anisotropic wet etching of Si (110) wafers is evaluated at two energies, C K{alpha}0.28 keV and Al K{alpha}1.49 keV. The obtained reflectivities at both energies are not represented by a simple planar mirror model considering surface roughness. Hence, an geometrical occultation effect due to step structures upon the etched mirror surface is taken into account. Then, the reflectivities are represented by the theoretical model. The estimated surface roughness at C K{alpha} ({approx}6 nm rms) is significantly larger than {approx}1 nm at Al K{alpha}. This can be explained by differentmore » coherent lengths at two energies.« less

Evaluation of the soft x-ray reflectivity of micropore optics using anisotropic wet etching of silicon wafers.

PubMed

Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Koshiishi, Masaki; Mita, Makoto; Maeda, Yoshitomo; Yamasaki, Noriko Y; Mitsuda, Kazuhisa; Shirata, Takayuki; Hayashi, Takayuki; Takano, Takayuki; Maeda, Ryutaro

2010-02-20

The x-ray reflectivity of an ultralightweight and low-cost x-ray optic using anisotropic wet etching of Si (110) wafers is evaluated at two energies, C K(alpha)0.28 keV and Al K(alpha)1.49 keV. The obtained reflectivities at both energies are not represented by a simple planar mirror model considering surface roughness. Hence, an geometrical occultation effect due to step structures upon the etched mirror surface is taken into account. Then, the reflectivities are represented by the theoretical model. The estimated surface roughness at C K(alpha) (approximately 6 nm rms) is significantly larger than approximately 1 nm at Al K(alpha). This can be explained by different coherent lengths at two energies.

New trends in space x-ray optics

NASA Astrophysics Data System (ADS)

Hudec, R.; Maršíková, V.; Pína, L.; Inneman, A.; Skulinová, M.

2017-11-01

The X-ray optics is a key element of various X-ray telescopes, X-ray microscopes, as well as other X-ray imaging instruments. The grazing incidence X-ray lenses represent the important class of X-ray optics. Most of grazing incidence (reflective) X-ray imaging systems used in astronomy but also in other (laboratory) applications are based on the Wolter 1 (or modified) arrangement. But there are also other designs and configurations proposed, used and considered for future applications both in space and in laboratory. The Kirkpatrick-Baez (K-B) lenses as well as various types of Lobster-Eye optics and MCP/Micropore optics serve as an example. Analogously to Wolter lenses, the X-rays are mostly reflected twice in these systems to create focal images. Various future projects in X-ray astronomy and astrophysics will require large segments with multiple thin shells or foils. The large Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All these space projects will require high quality and light segmented shells (bent or flat foils) with high X-ray reflectivity and excellent mechanical stability. The Multi Foil Optics (MFO) approach represent a promising alternative for both LE and K-B X-ray optical modules. Several types of reflecting substrates may be considered for these applications, with emphasis on thin float glass sheets and, more recently, high quality silicon wafers. This confirms the importance of non- Wolter X-ray optics designs for the future. Future large space X-ray telescopes (such as IXO) require precise and light-weight X-ray optics based on numerous thin reflecting shells. Novel approaches and advanced technologies are to be exploited and developed. In this contribution, we refer on results of tested X-ray mirror shells produced by glass thermal forming (GTF) and by shaping Si wafers. Both glass foils and Si wafers are commercially available, have excellent surface

Global optimization and reflectivity data fitting for x-ray multilayer mirrors by means of genetic algorithms

NASA Astrophysics Data System (ADS)

Sanchez del Rio, Manuel; Pareschi, Giovanni

2001-01-01

The x-ray reflectivity of a multilayer is a non-linear function of many parameters (materials, layer thicknesses, densities, roughness). Non-linear fitting of experimental data with simulations requires to use initial values sufficiently close to the optimum value. This is a difficult task when the space topology of the variables is highly structured, as in our case. The application of global optimization methods to fit multilayer reflectivity data is presented. Genetic algorithms are stochastic methods based on the model of natural evolution: the improvement of a population along successive generations. A complete set of initial parameters constitutes an individual. The population is a collection of individuals. Each generation is built from the parent generation by applying some operators (e.g. selection, crossover, mutation) on the members of the parent generation. The pressure of selection drives the population to include 'good' individuals. For large number of generations, the best individuals will approximate the optimum parameters. Some results on fitting experimental hard x-ray reflectivity data for Ni/C multilayers recorded at the ESRF BM5 are presented. This method could be also applied to the help in the design of multilayers optimized for a target application, like for an astronomical grazing-incidence hard X-ray telescopes.

X-ray shearing interferometer

DOEpatents

Koch, Jeffrey A [Livermore, CA

2003-07-08

An x-ray interferometer for analyzing high density plasmas and optically opaque materials includes a point-like x-ray source for providing a broadband x-ray source. The x-rays are directed through a target material and then are reflected by a high-quality ellipsoidally-bent imaging crystal to a diffraction grating disposed at 1.times. magnification. A spherically-bent imaging crystal is employed when the x-rays that are incident on the crystal surface are normal to that surface. The diffraction grating produces multiple beams which interfere with one another to produce an interference pattern which contains information about the target. A detector is disposed at the position of the image of the target produced by the interfering beams.

X-ray lasers

NASA Astrophysics Data System (ADS)

Elton, Raymond C.

Theoretical and practical aspects of X-ray lasers are discussed in an introduction emphasizing recent advances. Chapters are devoted to the unique optical properties of the X-ray spectral region, the principles of short-wavelength lasers, pumping by exciting plasma ions, pumping by electron capture into excited ionic states, pumping by ionization of atoms and ions, and alternative approaches. The potential scientific, technical, biological, and medical applications of X-ray lasers are briefly characterized.

Innovative space x-ray telescopes

NASA Astrophysics Data System (ADS)

Hudec, R.; Inneman, A.; Pina, L.; Sveda, L.; Ticha, H.; Brozek, V.

2017-11-01

We report on the progress in innovative X-ray mirror development with focus on requirements of future X-ray astronomy space projects. Various future projects in X-ray astronomy and astrophysics will require large lightweight but highly accurate segments with multiple thin shells or foils. The large Wolter 1 grazing incidence multiple mirror arrays, the Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All these space projects will require high quality and light segmented shells (shaped, bent or flat foils) with high X-ray reflectivity and excellent mechanical stability.

Quantitative disentanglement of coherent and incoherent laser-induced surface deformations by time-resolved x-ray reflectivity

NASA Astrophysics Data System (ADS)

Sander, M.; Pudell, J.-E.; Herzog, M.; Bargheer, M.; Bauer, R.; Besse, V.; Temnov, V.; Gaal, P.

2017-12-01

We present time-resolved x-ray reflectivity measurements on laser excited coherent and incoherent surface deformations of thin metallic films. Based on a kinematical diffraction model, we derive the surface amplitude from the diffracted x-ray intensity and resolve transient surface excursions with sub-Å spatial precision and 70 ps temporal resolution. The analysis allows for decomposition of the surface amplitude into multiple coherent acoustic modes and a substantial contribution from incoherent phonons which constitute the sample heating.

RF Phase Stability and Electron Beam Characterization for the PLEIADES Thomson X-Ray Source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Brown, W J; Hartemann, F V; Tremaine, A M

2002-10-16

We report on the performance of an S-band RF photocathode electron gun and accelerator for operation with the PLEIADES Thomson x-ray source at LLNL. To produce picosecond, high brightness x-ray pulses, picosecond timing, terahertz bandwidth diagnostics, and RF phase control are required. Planned optical, RF, x-ray and electron beam measurements to characterize the dependence of electron beam parameters and synchronization on RF phase stability are presented.

Angular Distribution of the X-ray Reflection in Accretion Disks

NASA Astrophysics Data System (ADS)

Garcia, Javier; Dauser, T.; Lohfink, A. M.; Kallman, T. R.; McClintock, J. E.; Steiner, J. F.; Brenneman, L.; Wilms, J.; Reynolds, C. S.; Tombesi, F.

2014-01-01

For the study of black holes, it is essential to have an accurate disk-reflection model with a proper treatment of the relativistic effects that occur near strong gravitational fields. These models are used to constrain the properties of the disk, including its inner radius, the degree of ionization of the gas, and the elemental abundances. Importantly, reflection models are the key to measuring black hole spin via the Fe-line method. However, most current reflection models only provide an angle-averaged solution for the flux reflected at the surface of the disk, which can systematically affect the inferred disk emission. We overcome this limitation by exploiting the full capabilities of our reflection code XILLVER. The solution of the reflected intensity of the radiation field is calculated for each photon energy, position in the slab, and viewing angle. We use this information to construct a grid of reflection models in which the inclination of the system is included as a free fitting parameter. Additionally, we directly connect the angle-resolved XILLVER model with the relativistic blurring code RELLINE to produce a self-consistent numerical model for to angular distribution of the reflected X-ray spectra from ionized accretion disks around black holes. The new model, RELCONV_XILL, is provided in the appropriate format to be used in combination with the commonly used fitting packages. An additional version of the new model, RELCONV_LP_XILL, which simulates the reflected spectra in a lampost scenario, is also supplied.

Characterization of X-Ray Diffraction System with a Microfocus X-Ray Source and a Polycapillary Optic

NASA Technical Reports Server (NTRS)

Gubarev, Mikhail; Marshall, Joy K.; Ciszak, Ewa; Ponomarev, Igor

2000-01-01

We present here an optimized microfocus x-ray source and polycapillary optic system designed for diffraction of small protein crystals. The x-ray beam is formed by a 5.5mm focal length capillary collimator coupled with a 40 micron x-ray source operating at 46Watts. Measurements of the x-ray flux, the divergence and the spectral characteristics of the beam are presented, This optimized system provides a seven fold greater flux than our recently reported configuration [M. Gubarev, et al., J. of Applied Crystallography (2000) 33, in press]. We now make a comparison with a 5kWatts rotating anode generator (Rigaku) coupled with confocal multilayer focusing mirrors (Osmic, CMF12- 38Cu6). The microfocus x-ray source and polycapillary collimator system delivers 60% of the x-ray flux from the rotating anode system. Additional ways to improve our microfocus x-ray system, and thus increase the x-ray flux will be discussed.

X-ray scattering signatures of β-thalassemia

NASA Astrophysics Data System (ADS)

Desouky, Omar S.; Elshemey, Wael M.; Selim, Nabila S.

2009-08-01

X-ray scattering from lyophilized proteins or protein-rich samples is characterized by the presence of two characteristic broad peaks at scattering angles equivalent to momentum transfer values of 0.27 and 0.6 nm -1, respectively. These peaks arise from the interference of coherently scattered photons. Once the conformation of a protein is changed, these two peaks reflect such change with considerable sensitivity. The present work examines the possibility of characterizing the most common cause of hemolytic anaemia in Egypt and many Mediterranean countries; β-thalassemia, from its X-ray scattering profile. This disease emerges from a genetic defect causing reduced rate in the synthesis of one of the globin chains that make up hemoglobin. As a result, structurally abnormal hemoglobin molecules are formed. In order to detect such molecular disorder, hemoglobin samples of β-thalassemia patients are collected, lyophilized and measured using a conventional X-ray diffractometer. Results show significant differences in the X-ray scattering profiles of most of the diseased samples compared to control. The shape of the first scattering peak at 0.27 nm -1, in addition to the relative intensity of the first to the second scattering peaks, provides the most reliable signs of abnormality in diseased samples. The results are interpreted and confirmed with the aid of Fourier Transform Infrared (FTIR) spectroscopy of normal and thalassemia samples.

X-ray absorption and reflection as probes of the GaN conduction bands: Theory and experiments

DOE Office of Scientific and Technical Information (OSTI.GOV)

Lambrecht, W.R.L.; Rashkeev, S.N.; Segall, B.

1997-04-01

X-ray absorption measurements are a well-known probe of the unoccupied states in a material. The same information can be obtained by using glancing angle X-ray reflectivity. In spite of several existing band structure calculations of the group III nitrides and previous optical studies in UV range, a direct probe of their conduction band densities of states is of interest. The authors performed a joint experimental and theoretical investigation using both of these experimental techniques for wurtzite GaN.

X-ray characterization of a multichannel smart-pixel array detector.

PubMed

Ross, Steve; Haji-Sheikh, Michael; Huntington, Andrew; Kline, David; Lee, Adam; Li, Yuelin; Rhee, Jehyuk; Tarpley, Mary; Walko, Donald A; Westberg, Gregg; Williams, George; Zou, Haifeng; Landahl, Eric

2016-01-01

The Voxtel VX-798 is a prototype X-ray pixel array detector (PAD) featuring a silicon sensor photodiode array of 48 × 48 pixels, each 130 µm × 130 µm × 520 µm thick, coupled to a CMOS readout application specific integrated circuit (ASIC). The first synchrotron X-ray characterization of this detector is presented, and its ability to selectively count individual X-rays within two independent arrival time windows, a programmable energy range, and localized to a single pixel is demonstrated. During our first trial run at Argonne National Laboratory's Advance Photon Source, the detector achieved a 60 ns gating time and 700 eV full width at half-maximum energy resolution in agreement with design parameters. Each pixel of the PAD holds two independent digital counters, and the discriminator for X-ray energy features both an upper and lower threshold to window the energy of interest discarding unwanted background. This smart-pixel technology allows energy and time resolution to be set and optimized in software. It is found that the detector linearity follows an isolated dead-time model, implying that megahertz count rates should be possible in each pixel. Measurement of the line and point spread functions showed negligible spatial blurring. When combined with the timing structure of the synchrotron storage ring, it is demonstrated that the area detector can perform both picosecond time-resolved X-ray diffraction and fluorescence spectroscopy measurements.

X ray imaging microscope for cancer research

NASA Technical Reports Server (NTRS)

Hoover, Richard B.; Shealy, David L.; Brinkley, B. R.; Baker, Phillip C.; Barbee, Troy W., Jr.; Walker, Arthur B. C., Jr.

1991-01-01

The NASA technology employed during the Stanford MSFC LLNL Rocket X Ray Spectroheliograph flight established that doubly reflecting, normal incidence multilayer optics can be designed, fabricated, and used for high resolution x ray imaging of the Sun. Technology developed as part of the MSFC X Ray Microscope program, showed that high quality, high resolution multilayer x ray imaging microscopes are feasible. Using technology developed at Stanford University and at the DOE Lawrence Livermore National Laboratory (LLNL), Troy W. Barbee, Jr. has fabricated multilayer coatings with near theoretical reflectivities and perfect bandpass matching for a new rocket borne solar observatory, the Multi-Spectral Solar Telescope Array (MSSTA). Advanced Flow Polishing has provided multilayer mirror substrates with sub-angstrom (rms) smoothnesss for the astronomical x ray telescopes and x ray microscopes. The combination of these important technological advancements has paved the way for the development of a Water Window Imaging X Ray Microscope for cancer research.

Parametric studies and characterization measurements of x-ray lithography mask membranes

NASA Astrophysics Data System (ADS)

Wells, Gregory M.; Chen, Hector T. H.; Engelstad, Roxann L.; Palmer, Shane R.

1991-08-01

The techniques used in the experimental characterization of thin membranes are considered for their potential use as mask blanks for x-ray lithography. Among the parameters of interest for this evaluation are the film's stress, fracture strength, uniformity of thickness, absorption in the x-ray and visible spectral regions and the modulus and grain structure of the material. The experimental techniques used for measuring these properties are described. The accuracy and applicability of the assumptions used to derive the formulas that relate the experimental measurements to the parameters of interest are considered. Experimental results for silicon carbide and diamond films are provided. Another characteristic needed for an x-ray mask carrier is radiation stability. The number of x-ray exposures expected to be performed in the lifetime of an x-ray mask on a production line is on the order of 107. The dimensional stability requirements placed on the membranes during this period are discussed. Interferometric techniques that provide sufficient sensitivity for these stability measurements are described. A comparison is made between the different techniques that have been developed in term of the information that each technique provides, the accuracy of the various techniques, and the implementation issues that are involved with each technique.

X-ray characterization of solid small molecule organic materials

DOEpatents

Billinge, Simon; Shankland, Kenneth; Shankland, Norman; Florence, Alastair

2014-06-10

The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.

Combining experiment and optical simulation in coherent X-ray nanobeam characterization of Si/SiGe semiconductor heterostructures

DOE PAGES

Tilka, J. A.; Park, J.; Ahn, Y.; ...

2016-07-06

Here, the highly coherent and tightly focused x-ray beams produced by hard x-ray light sources enable the nanoscale characterization of the structure of electronic materials but are accompanied by significant challenges in the interpretation of diffraction and scattering patterns. X-ray nanobeams exhibit optical coherence combined with a large angular divergence introduced by the x-ray focusing optics. The scattering of nanofocused x-ray beams from intricate semiconductor heterostructures produces a complex distribution of scattered intensity. We report here an extension of coherent xray optical simulations of convergent x-ray beam diffraction patterns to arbitrary x-ray incident angles to allow the nanobeam diffraction patternsmore » of complex heterostructures to be simulated faithfully. These methods are used to extract the misorientation of lattice planes and the strain of individual layers from synchrotron x-ray nanobeam diffraction patterns of Si/SiGe heterostructures relevant to applications in quantum electronic devices. The systematic interpretation of nanobeam diffraction patterns from semiconductor heterostructures presents a new opportunity in characterizing and ultimately designing electronic materials.« less

Development of X-ray CCD camera based X-ray micro-CT system

NASA Astrophysics Data System (ADS)

Sarkar, Partha S.; Ray, N. K.; Pal, Manoj K.; Baribaddala, Ravi; Agrawal, Ashish; Kashyap, Y.; Sinha, A.; Gadkari, S. C.

2017-02-01

Availability of microfocus X-ray sources and high resolution X-ray area detectors has made it possible for high resolution microtomography studies to be performed outside the purview of synchrotron. In this paper, we present the work towards the use of an external shutter on a high resolution microtomography system using X-ray CCD camera as a detector. During micro computed tomography experiments, the X-ray source is continuously ON and owing to the readout mechanism of the CCD detector electronics, the detector registers photons reaching it during the read-out period too. This introduces a shadow like pattern in the image known as smear whose direction is defined by the vertical shift register. To resolve this issue, the developed system has been incorporated with a synchronized shutter just in front of the X-ray source. This is positioned in the X-ray beam path during the image readout period and out of the beam path during the image acquisition period. This technique has resulted in improved data quality and hence the same is reflected in the reconstructed images.

Benchmarking the x-ray phase contrast imaging for ICF DT ice characterization using roughened surrogates

DOE Office of Scientific and Technical Information (OSTI.GOV)

Dewald, E; Kozioziemski, B; Moody, J

2008-06-26

We use x-ray phase contrast imaging to characterize the inner surface roughness of DT ice layers in capsules planned for future ignition experiments. It is therefore important to quantify how well the x-ray data correlates with the actual ice roughness. We benchmarked the accuracy of our system using surrogates with fabricated roughness characterized with high precision standard techniques. Cylindrical artifacts with azimuthally uniform sinusoidal perturbations with 100 um period and 1 um amplitude demonstrated 0.02 um accuracy limited by the resolution of the imager and the source size of our phase contrast system. Spherical surrogates with random roughness close tomore » that required for the DT ice for a successful ignition experiment were used to correlate the actual surface roughness to that obtained from the x-ray measurements. When comparing average power spectra of individual measurements, the accuracy mode number limits of the x-ray phase contrast system benchmarked against surface characterization performed by Atomic Force Microscopy are 60 and 90 for surrogates smoother and rougher than the required roughness for the ice. These agreement mode number limits are >100 when comparing matching individual measurements. We will discuss the implications for interpreting DT ice roughness data derived from phase-contrast x-ray imaging.« less

ACCRETION DISK SIGNATURES IN TYPE I X-RAY BURSTS: PROSPECTS FOR FUTURE MISSIONS

DOE Office of Scientific and Technical Information (OSTI.GOV)

Keek, L.; Wolf, Z.; Ballantyne, D. R., E-mail: laurens.keek@nasa.gov

2016-07-20

Type I X-ray bursts and superbursts from accreting neutron stars illuminate the accretion disk and produce a reflection signal that evolves as the burst fades. Examining the evolution of reflection features in the spectra will provide insight into the burst–disk interaction, a potentially powerful probe of accretion disk physics. At present, reflection has been observed during only two bursts of exceptional duration. We investigate the detectability of reflection signatures with four of the latest well-studied X-ray observatory concepts: Hitomi , Neutron Star Interior Composition Explorer ( NICER ), Athena , and Large Observatory For X-ray Timing ( LOFT ). Burstmore » spectra are modeled for different values for the flux, temperature, and the disk ionization parameter, which are representative for most known bursts and sources. The effective area and throughput of a Hitomi -like telescope are insufficient for characterizing burst reflection features. NICER and Athena will detect reflection signatures in Type I bursts with peak fluxes ≳10{sup 7.5} erg cm{sup 2} s{sup 1} and also effectively constrain the reflection parameters for bright bursts with fluxes of ∼10{sup 7} erg cm{sup 2} s{sup 1} in exposures of several seconds. Thus, these observatories will provide crucial new insight into the interaction of accretion flows and X-ray bursts. For sources with low line-of-sight absorption, the wide bandpass of these instruments allows for the detection of soft X-ray reflection features, which are sensitive to the disk metallicity and density. The large collecting area that is part of the LOFT design would revolutionize the field by tracing the evolution of the accretion geometry in detail throughout short bursts.« less

Impulsive solar X-ray bursts. 4: Polarization, directivity and spectrum of the reflected and total bremsstrahlung radiation from a beam of electrons directed toward the photosphere

NASA Technical Reports Server (NTRS)

Langer, S. H.; Petrosian, V.

1976-01-01

A Monte Carlo method is described for evaluation of the spectrum, directivity and polarization of X-rays diffusely reflected from stellar photospheres. the accuracy of the technique is evaluated through comparison with analytic results. Using the characteristics of the incident X-rays of the model for solar X-ray flares, the spectrum, directivity and polarization of the reflected and the total X-ray fluxes are evaluated. The results are compared with observations.

Micromirror-based manipulation of synchrotron x-ray beams

NASA Astrophysics Data System (ADS)

Walko, D. A.; Chen, Pice; Jung, I. W.; Lopez, D.; Schwartz, C. P.; Shenoy, G. K.; Wang, Jin

2017-08-01

Synchrotron beamlines typically use macroscopic, quasi-static optics to manipulate x-ray beams. We present the use of dynamic microelectromechanical systems-based optics (MEMS) to temporally modulate synchrotron x-ray beams. We demonstrate this concept using single-crystal torsional MEMS micromirrors oscillating at frequencies of 75 kHz. Such a MEMS micromirror, with lateral dimensions of a few hundred micrometers, can interact with x rays by operating in grazing-incidence reflection geometry; x rays are deflected only when an x-ray pulse is incident on the rotating micromirror under appropriate conditions, i.e., at an angle less than the critical angle for reflectivity. The time window for such deflections depends on the frequency and amplitude of the MEMS rotation. We demonstrate that reflection geometry can produce a time window of a few microseconds. We further demonstrate that MEMS optics can isolate x rays from a selected synchrotron bunch or group of bunches. With ray-trace simulations we explain the currently achievable time windows and suggest a path toward improvements.

Combining theory and experiment for X-ray absorption spectroscopy and resonant X-ray scattering characterization of polymers

DOE PAGES

Su, Gregory M.; Cordova, Isvar A.; Brady, Michael A.; ...

2016-07-04

We present that an improved understanding of fundamental chemistry, electronic structure, morphology, and dynamics in polymers and soft materials requires advanced characterization techniques that are amenable to in situ and operando studies. Soft X-ray methods are especially useful in their ability to non-destructively provide information on specific materials or chemical moieties. Analysis of these experiments, which can be very dependent on X-ray energy and polarization, can quickly become complex. Complementary modeling and predictive capabilities are required to properly probe these critical features. Here, we present relevant background on this emerging suite of techniques. Finally, we focus on how the combinationmore » of theory and experiment has been applied and can be further developed to drive our understanding of how these methods probe relevant chemistry, structure, and dynamics in soft materials.« less

New X-Ray Technique to Characterize Nanoscale Precipitates in Aged Aluminum Alloys

NASA Astrophysics Data System (ADS)

Sitdikov, V. D.; Murashkin, M. Yu.; Valiev, R. Z.

2017-10-01

This paper puts forward a new technique for measurement of x-ray patterns, which enables to solve the problem of identification and determination of precipitates (nanoscale phases) in metallic alloys of the matrix type. The minimum detection limit of precipitates in the matrix of the base material provided by this technique constitutes as little as 1%. The identification of precipitates in x-ray patterns and their analysis are implemented through a transmission mode with a larger radiation area, longer holding time and higher diffractometer resolution as compared to the conventional reflection mode. The presented technique has been successfully employed to identify and quantitatively describe precipitates formed in the Al alloy of the Al-Mg-Si system as a result of artificial aging. For the first time, the x-ray phase analysis has been used to identify and measure precipitates formed during the alloy artificial aging.

X-ray lithography using holographic images

DOEpatents

Howells, M.S.; Jacobsen, C.

1997-03-18

Methods for forming X-ray images having 0.25 {micro}m minimum line widths on X-ray sensitive material are presented. A holographic image of a desired circuit pattern is projected onto a wafer or other image-receiving substrate to allow recording of the desired image in photoresist material. In one embodiment, the method uses on-axis transmission and provides a high flux X-ray source having modest monochromaticity and coherence requirements. A layer of light-sensitive photoresist material on a wafer with a selected surface is provided to receive the image(s). The hologram has variable optical thickness and variable associated optical phase angle and amplitude attenuation for transmission of the X-rays. A second embodiment uses off-axis holography. The wafer receives the holographic image by grazing incidence reflection from a hologram printed on a flat metal or other highly reflecting surface or substrate. In this second embodiment, an X-ray beam with a high degree of monochromaticity and spatial coherence is required. 15 figs.

X-ray lithography using holographic images

DOEpatents

Howells, Malcolm S.; Jacobsen, Chris

1997-01-01

Methods for forming X-ray images having 0.25 .mu.m minimum line widths on X-ray sensitive material are presented. A holgraphic image of a desired circuit pattern is projected onto a wafer or other image-receiving substrate to allow recording of the desired image in photoresist material. In one embodiment, the method uses on-axis transmission and provides a high flux X-ray source having modest monochromaticity and coherence requirements. A layer of light-sensitive photoresist material on a wafer with a selected surface is provided to receive the image(s). The hologram has variable optical thickness and variable associated optical phase angle and amplitude attenuation for transmission of the X-rays. A second embodiment uses off-axis holography. The wafer receives the holographic image by grazing incidence reflection from a hologram printed on a flat metal or other highly reflecting surface or substrate. In this second embodiment, an X-ray beam with a high degree of monochromaticity and spatial coherence is required.

High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.

PubMed

Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf A; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan

2017-10-10

V/Sc multilayer is experimentally demonstrated for the first time as a high reflectance mirror for the soft X-ray water window region. It primarily works at above the Sc-L edge (λ = 3.11 nm) under near normal incidence while a second peak appears at above the V-L edge (λ = 2.42 nm) under grazing incidence. The V/Sc multilayer fabricated with a d-spacing of 1.59 nm and 30 bilayers has a smaller interface width (σ = 0.27 and 0.32 nm) than the conventional used Cr/Sc (σ = 0.28 and 0.47 nm). For V/Sc multilayer with 30 bilayers, the introduction of B 4 C barrier layers has little improvement on the interface structure. As the number of bilayers increasing to 400, the growth morphology and microstructure of the V/Sc layers evolves with slightly increased crystallization. Nevertheless, the surface roughness remains to be 0.25 nm. A maximum soft X-ray reflectance of 18.4% is measured at λ = 3.129 nm at 9° off-normal incidence using the 400-bilayers V/Sc multilayer. According to the fitted model, an s-polarization reflectance of 5.2% can also be expected at λ = 2.425 nm under 40° incidence. Based on the promising experimental results, further improvement of the reflectance can be achieved by using a more stable deposition system, exploring different interface engineering methods and so on.

Elemental concentration analysis in prostate tissues using total reflection X-ray fluorescence

NASA Astrophysics Data System (ADS)

Leitão, R. G.; Palumbo, A.; Souza, P. A. V. R.; Pereira, G. R.; Canellas, C. G. L.; Anjos, M. J.; Nasciutti, L. E.; Lopes, R. T.

2014-02-01

Prostate cancer (PCa) currently represents the second most prevalent malignant neoplasia in men, representing 21% of all cancer cases. Benign Prostate Hyperplasia (BPH) is an illness prevailing in men above the age of 50, close to 90% after the age of 80. The prostate presents a high zinc concentration, about 10-fold higher than any other body tissue. In this work, samples of human prostate tissues with cancer, BPH and normal tissue were analyzed utilizing total reflection X-ray fluorescence spectroscopy using synchrotron radiation technique (SR-TXRF) to investigate the differences in the elemental concentrations in these tissues. SR-TXRF analyses were performed at the X-ray fluorescence beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, São Paulo. It was possible to determine the concentrations of the following elements: P, S, K, Ca, Fe, Cu, Zn and Rb. By using Mann-Whitney U test it was observed that almost all elements presented concentrations with significant differences (α=0.05) between the groups studied.

X-ray reflectivity study of formation of multilayer porous anodic oxides of silicon.

DOE Office of Scientific and Technical Information (OSTI.GOV)

Chu, Y.; Fenollosa, R.; Parkhutik, V.

1999-07-21

The paper reports data on the kinetics of anodic oxide films growth on silicon in aqueous solutions of phosphoric acids as well as a study of the morphology of the oxides grown in a special regime of the oscillating anodic potential. X-ray reflectivity measurements were performed on the samples of anodic oxides using an intense synchrotron radiation source. They have a multilayer structure as revealed by theoretical fitting of the reflectivity data. The oscillations of the anodic potential are explained in terms of synchronized oxidation/dissolution reactions at the silicon surface and accumulation of mechanic stress in the oxide film.

Structural characterization of porous low-k thin films prepared by different techniques using x-ray porosimetry

NASA Astrophysics Data System (ADS)

Lee, Hae-Jeong; Soles, Christopher L.; Liu, Da-Wei; Bauer, Barry J.; Lin, Eric K.; Wu, Wen-li; Grill, Alfred

2004-03-01

Three different types of porous low-k dielectric films, with similar dielectric constants, are characterized using x-ray porosimetry (XRP). XRP is used to extract critical structural information, such as the average density, wall density, porosity, and pore size distribution. The materials include a plasma-enhanced-chemical-vapor-deposited carbon-doped oxide film composed of Si, C, O, and H (SiCOH) and two spin cast silsesquioxane type films—methylsilsesquioxane with a polymeric porogen (porous MSQ) and hydrogensilsesquioxane with a high boiling point solvent (porous HSQ). The porous SiCOH film displays the smallest pore sizes, while porous HSQ film has both the highest density wall material and porosity. The porous MSQ film exhibits a broad range of pores with the largest average pore size. We demonstrate that the average pore size obtained by the well-established method of neutron scattering and x-ray reflectivity is in good agreement with the XRP results.

RefleX: X-ray absorption and reflection in active galactic nuclei for arbitrary geometries

NASA Astrophysics Data System (ADS)

Paltani, S.; Ricci, C.

2017-11-01

Reprocessed X-ray radiation carries important information about the structure and physical characteristics of the material surrounding the supermassive black hole (SMBH) in active galactic nuclei (AGN). We report here on a newly developed simulation platform, RefleX, which allows to reproduce absorption and reflection by quasi-arbitrary geometries. We show here the reliability of our approach by comparing the results of our simulations with existing spectral models such as pexrav, MYTorus and BNTorus. RefleX implements both Compton scattering on free electrons and Rayleigh scattering and Compton scattering on bound electrons. We show the effect of bound-electron corrections on a torus geometry simulated like in MYTorus. We release with this paper the RefleX executable, as well as RXTorus, a model that assumes absorption and reflection from a torus with a varying ratio of the minor to major axis of the torus. To allow major flexibility RXTorus is also distributed in three components: absorbed primary emission, scattered radiation and fluorescent lines. RXTorus is provided for different values of the abundance, and with (atomic configuration) or without (free-electron configuration) taking into account Rayleigh scattering and bound electrons. We apply the RXTorus model in both configurations on the XMM-Newton and NuSTAR spectrum of the Compton-thick AGN NGC 424 and find that the models are able to reproduce very well the observations, but that the assumption on the bound or free state of the electrons has significant consequences on the fit parameters. RefleX executable, user manual and example models are available at http://www.astro.unige.ch/reflex. A copy of the RefleX executable is also available at the CDS via anonymous ftp to http://cdsarc.u-strasbg.fr (http://130.79.128.5) or via http://cdsarc.u-strasbg.fr/viz-bin/qcat?J/A+A/607/A31

Characterizing the X-ray Emission in Small Magellanic Cloud Supernova Remnants

NASA Astrophysics Data System (ADS)

Man, Nicole; Auchettl, Katie; Lopez, Laura

2018-01-01

The Small Magellanic Cloud is a close, metal-poor galaxy with active star formation, and it has a diverse population of 24 supernova remnants (SNRs) that have been identified at several wavelengths. Past work has characterized the X-ray emission in these sources separately and aimed to constrain their explosive origins from observations with Chandra and XMM-Newton. Three SNRs have possible evidence for Type Ia explosions based on strong Fe-L emission in their X-ray spectra, although the environments and intermediate-mass element abundances are more consistent with those of core-collapse SNe. In this poster, we analyze the archival Chandra and XMM-Newton observations of the SMC SNR sample, and we model the sources' X-ray spectra in a systematic way to derive the plasma properties and to constrain the nature of the explosions. In one SNR, we note the presence of an X-ray binary near the source's geometric center, suggesting the compact object was produced in the SN explosion. As one of only three SNRs known in the Local Group to host a binary system, this source is worthy of follow-up investigations to probe explosions of massive stars in binary systems.

The Ferrara hard X-ray facility for testing/calibrating hard X-ray focusing telescopes

NASA Astrophysics Data System (ADS)

Loffredo, Gianluca; Frontera, Filippo; Pellicciotta, Damiano; Pisa, Alessandro; Carassiti, Vito; Chiozzi, Stefano; Evangelisti, Federico; Landi, Luca; Melchiorri, Michele; Squerzanti, Stefano

2005-12-01

We will report on the current configuration of the X-ray facility of the University of Ferrara recently used to perform reflectivity tests of mosaic crystals and to calibrate the experiment JEM X aboard Integral. The facility is now located in the technological campus of the University of Ferrara in a new building (named LARIX laboratory= LARge Italian X-ray facility) that includes a tunnel 100 m long with, on the sides, two large experimental rooms. The facility is being improved for determining the optical axis of mosaic crystals in Laue configuration, for calibrating Laue lenses and hard X-ray mirror prototypes.

Analytical characterization of a new mobile X-ray fluorescence and X-ray diffraction instrument combined with a pigment identification case study

NASA Astrophysics Data System (ADS)

Van de Voorde, Lien; Vekemans, Bart; Verhaeven, Eddy; Tack, Pieter; De Wolf, Robin; Garrevoet, Jan; Vandenabeele, Peter; Vincze, Laszlo

2015-08-01

A new, commercially available, mobile system combining X-ray diffraction and X-ray fluorescence has been evaluated which enables both elemental analysis and phase identification simultaneously. The instrument makes use of a copper or molybdenum based miniature X-ray tube and a silicon-Pin diode energy-dispersive detector to count the photons originating from the samples. The X-ray tube and detector are both mounted on an X-ray diffraction protractor in a Bragg-Brentano θ:θ geometry. The mobile instrument is one of the lightest and most compact instruments of its kind (3.5 kg) and it is thus very useful for in situ purposes such as the direct (non-destructive) analysis of cultural heritage objects which need to be analyzed on site without any displacement. The supplied software allows both the operation of the instrument for data collection and in-depth data analysis using the International Centre for Diffraction Data database. This paper focuses on the characterization of the instrument, combined with a case study on pigment identification and an illustrative example for the analysis of lead alloyed printing letters. The results show that this commercially available light-weight instrument is able to identify the main crystalline phases non-destructively, present in a variety of samples, with a high degree of flexibility regarding sample size and position.

Feasibility study of total reflection X-ray fluorescence analysis using a liquid metal jet X-ray tube

NASA Astrophysics Data System (ADS)

Maderitsch, A.; Smolek, S.; Wobrauschek, P.; Streli, C.; Takman, P.

2014-09-01

Total reflection X-ray spectroscopy (TXRF) is a powerful analytical technique for qualitative and quantitative analysis of trace and ultratrace elements in a sample with lower limits of detection (LLDs) of pg/g to ng/g in concentration and absolute high fg levels are attainable. Several X-ray sources, from low power (few W), 18 kW rotating anodes to synchrotron radiation, are in use for the excitation and lead accordingly to their photon flux delivered on the sample the detection limits specified. Not only the power, but also the brilliance and focal shape are of importance for TXRF. A microfocus of 50-100 μm spot size or the line focus of diffraction tubes is best suited. Excillum developed a new approach in the design of a source: the liquid metal jet anode. In this paper the results achieved with this source are described. A versatile TXRF spectrometer with vacuum chamber designed at Atominstitut was used for the experiments. A multilayer monochromator selecting the intensive Ga-Kα radiation was taken and the beam was collimated by 50 μm slits. Excellent results regarding geometric beam stability, high fluorescence intensities and low background were achieved leading to detection limits in the high fg range for Ni. A 100 mm2 silicon drift detector (SDD) collimated to 80 mm2 was used to collect the fluorescence radiation. The results from measurements on single element samples are presented.

JEUMICO: Czech-Bavarian astronomical X-ray optics project

NASA Astrophysics Data System (ADS)

Hudec, R.; Döhring, T.

2017-07-01

Within the project JEUMICO, an acronym for "Joint European Mirror Competence", the Aschaffenburg University of Applied Sciences and the Czech Technical University in Prague started a collaboration to develop mirrors for X-ray telescopes. Corresponding mirror segments use substrates of flat silicon wafers which are coated with thin iridium films, as this material is promising high reflectivity in the X-ray range of interest. The sputtering parameters are optimized in the context of the expected reflectivity of the coated X-ray mirrors. In near future measurements of the assembled mirror modules optical performances are planned at an X-ray test facility.

Normal incidence x-ray mirror for chemical microanalysis

DOEpatents

Carr, M.J.; Romig, A.D. Jr.

1987-08-05

An x-ray mirror for both electron column instruments and micro x-ray fluorescence instruments for making chemical, microanalysis comprises a non-planar mirror having, for example, a spherical reflecting surface for x-rays comprised of a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on a substrate and whose layers have a thickness which is a multiple of the wavelength being reflected. For electron column instruments, the wavelengths of interest lie above 1.5nm, while for x-ray fluorescence instruments, the range of interest is below 0.2nm. 4 figs.

Demonstration of x-ray Thomson scattering using picosecond K-α x-ray sources in the characterization of dense heated matter

DOE PAGES

Kritcher, A. L.; Neumayer, P.; Lee, H. J.; ...

2008-10-31

Here, we present K-α x-ray Thomson scattering from shock compressed matter for use as a diagnostic in determining the temperature, density, and ionization state with picosecond resolution. The development of this source as a diagnostic as well as stringent requirements for successful K-α x-ray Thomson scattering are addressed. Here, the first elastic and inelastic scattering measurements on a medium size laser facility have been observed. We present scattering data from solid density carbon plasmas with >1X 10 5 photons in the elastic peak that validate the capability of single shot characterization of warm dense matter and the ability to usemore » this scattering source at future free electron lasers and for fusion experiments at the National Ignition Facility (NIF), LLNL.« less

Design of a normal incidence multilayer imaging X-ray microscope

NASA Astrophysics Data System (ADS)

Shealy, David L.; Gabardi, David R.; Hoover, Richard B.; Walker, Arthur B. C., Jr.; Lindblom, Joakim F.

Normal incidence multilayer Cassegrain X-ray telescopes were flown on the Stanford/MSFC Rocket X-ray Spectroheliograph. These instruments produced high spatial resolution images of the sun and conclusively demonstrated that doubly reflecting multilayer X-ray optical systems are feasible. The images indicated that aplanatic imaging soft X-ray/EUV microscopes should be achievable using multilayer optics technology. A doubly reflecting normal incidence multilayer imaging X-ray microscope based on the Schwarzschild configuration has been designed. The design of the microscope and the results of the optical system ray trace analysis are discussed. High resolution aplanatic imaging X-ray microscopes using normal incidence multilayer X-ray mirrors should have many important applications in advanced X-ray astronomical instrumentation, X-ray lithography, biological, biomedical, metallurgical, and laser fusion research.

A high-density relativistic reflection origin for the soft and hard X-ray excess emission from Mrk 1044

NASA Astrophysics Data System (ADS)

Mallick, L.; Alston, W. N.; Parker, M. L.; Fabian, A. C.; Pinto, C.; Dewangan, G. C.; Markowitz, A.; Gandhi, P.; Kembhavi, A. K.; Misra, R.

2018-06-01

We present the first results from a detailed spectral-timing analysis of a long (˜130 ks) XMM-Newton observation and quasi-simultaneous NuSTAR and Swift observations of the highly-accreting narrow-line Seyfert 1 galaxy Mrk 1044. The broadband (0.3-50 keV) spectrum reveals the presence of a strong soft X-ray excess emission below ˜1.5 keV, iron Kα emission complex at ˜6 -7 keV and a `Compton hump' at ˜15 -30 keV. We find that the relativistic reflection from a high-density accretion disc with a broken power-law emissivity profile can simultaneously explain the soft X-ray excess, highly ionized broad iron line and the Compton hump. At low frequencies ([2 - 6] × 10-5 Hz), the power-law continuum dominated 1.5-5 keV band lags behind the reflection dominated 0.3-1 keV band, which is explained with a combination of propagation fluctuation and Comptonization processes, while at higher frequencies ([1 - 2] × 10-4 Hz), we detect a soft lag which is interpreted as a signature of X-ray reverberation from the accretion disc. The fractional root-mean-squared (rms) variability of the source decreases with energy and is well described by two variable components: a less variable relativistic disc reflection and a more variable direct coronal emission. Our combined spectral-timing analyses suggest that the observed broadband X-ray variability of Mrk 1044 is mainly driven by variations in the location or geometry of the optically thin, hot corona.

NUSTAR and Suzaku x-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

DOE Office of Scientific and Technical Information (OSTI.GOV)

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spinmore » $$a\\gt 0.9$$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. We discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.« less

Telescope for x ray and gamma ray studies in astrophysics

NASA Technical Reports Server (NTRS)

Weaver, W. D.; Desai, Upendra D.

1993-01-01

Imaging of x-rays has been achieved by various methods in astrophysics, nuclear physics, medicine, and material science. A new method for imaging x-ray and gamma-ray sources avoids the limitations of previously used imaging devices. Images are formed in optical wavelengths by using mirrors or lenses to reflect and refract the incoming photons. High energy x-ray and gamma-ray photons cannot be reflected except at grazing angles and pass through lenses without being refracted. Therefore, different methods must be used to image x-ray and gamma-ray sources. Techniques using total absorption, or shadow casting, can provide images in x-rays and gamma-rays. This new method uses a coder made of a pair of Fresnel zone plates and a detector consisting of a matrix of CsI scintillators and photodiodes. The Fresnel zone plates produce Moire patterns when illuminated by an off-axis source. These Moire patterns are deconvolved using a stepped sine wave fitting or an inverse Fourier transform. This type of coder provides the capability of an instantaneous image with sub-arcminute resolution while using a detector with only a coarse position-sensitivity. A matrix of the CsI/photodiode detector elements provides the necessary coarse position-sensitivity. The CsI/photodiode detector also allows good energy resolution. This imaging system provides advantages over previously used imaging devices in both performance and efficiency.

Characterization of SiGe thin films using a laboratory X-ray instrument.

PubMed

Ulyanenkova, Tatjana; Myronov, Maksym; Benediktovitch, Andrei; Mikhalychev, Alexander; Halpin, John; Ulyanenkov, Alex

2013-08-01

The technique of reciprocal space mapping using X-rays is a recognized tool for the nondestructive characterization of epitaxial films. X-ray scattering from epitaxial Si 0.4 Ge 0.6 films on Si(100) substrates using a laboratory X-ray source was investigated. It is shown that a laboratory source with a rotating anode makes it possible to investigate the material parameters of the super-thin 2-6 nm layers. For another set of partially relaxed layers, 50-200 nm thick, it is shown that from a high-resolution reciprocal space map, conditioned from diffuse scattering on dislocations, it is possible to determine quantitatively from the shape of a diffraction peak (possessing no thickness fringes) additional parameters such as misfit dislocation density and layer thickness as well as concentration and relaxation.

The iron complex in high mass X-ray binaries

NASA Astrophysics Data System (ADS)

Giménez-García, A.; Torrejón, J. M.; Martínez-Núñez, S.; Rodes-Rocas, J. J.; Bernabéu, G.

2013-05-01

An X-ray binary system consists of a compact object (a white dwarf, a neutron star or a black hole) accreting material from an optical companion star. The spectral type of the optical component strongly affects the mass transfer to the compact object. This is the reason why X-ray binary systems are usually divided in High Mass X-ray Binaries (companion O or B type, denoted HMXB) and Low Mass X-ray Binaries (companion type A or later). The HMXB are divided depending on the partner's luminosity class in two main groups: the Supergiant X-ray Binaries (SGXB) and Be X-ray Binaries (BeXB). We introduce the spectral characterization of a sample of 9 High Mass X-ray Binaries in the iron complex (˜ 6-7 keV). This spectral range is a fundamental tool in the study of the surrounding material of these systems. The sources have been divided into three main groups according to their current standard classification: SGXB, BeXB and γ Cassiopeae-like. The purpose of this work is to look for qualitative patterns in the iron complex, around 6-7 keV, in order to discern between current different classes that make up the group of HMXB. We find significant spectral patterns for each of the sets, reflecting differences in accretion physics thereof.

Development of Total Reflection X-ray fluorescence spectrometry quantitative methodologies for elemental characterization of building materials and their degradation products

NASA Astrophysics Data System (ADS)

García-Florentino, Cristina; Maguregui, Maite; Marguí, Eva; Torrent, Laura; Queralt, Ignasi; Madariaga, Juan Manuel

2018-05-01

In this work, a Total Reflection X-ray fluorescence (TXRF) spectrometry based quantitative methodology for elemental characterization of liquid extracts and solids belonging to old building materials and their degradation products from a building of the beginning of 20th century with a high historic cultural value in Getxo, (Basque Country, North of Spain) is proposed. This quantification strategy can be considered a faster methodology comparing to traditional Energy or Wavelength Dispersive X-ray fluorescence (ED-XRF and WD-XRF) spectrometry based methodologies or other techniques such as Inductively Coupled Plasma Mass Spectrometry (ICP-MS). In particular, two kinds of liquid extracts were analysed: (i) water soluble extracts from different mortars and (ii) acid extracts from mortars, black crusts, and calcium carbonate formations. In order to try to avoid the acid extraction step of the materials and their degradation products, it was also studied the TXRF direct measurement of the powdered solid suspensions in water. With this aim, different parameters such as the deposition volume and the measuring time were studied for each kind of samples. Depending on the quantified element, the limits of detection achieved with the TXRF quantitative methodologies for liquid extracts and solids were set around 0.01-1.2 and 2-200 mg/L respectively. The quantification of K, Ca, Ti, Mn, Fe, Zn, Rb, Sr, Sn and Pb in the liquid extracts was proved to be a faster alternative to other more classic quantification techniques (i.e. ICP-MS), accurate enough to obtain information about the composition of the acidic soluble part of the materials and their degradation products. Regarding the solid samples measured as suspensions, it was quite difficult to obtain stable and repetitive suspensions affecting in this way the accuracy of the results. To cope with this problem, correction factors based on the quantitative results obtained using ED-XRF were calculated to improve the accuracy of

Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines

PubMed Central

Alcock, Simon G.; Nistea, Ioana; Sutter, John P.; Sawhney, Kawal; Fermé, Jean-Jacques; Thellièr, Christophe; Peverini, Luca

2015-01-01

Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the ‘junction effect’: a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts. PMID:25537582

Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines.

PubMed

Alcock, Simon G; Nistea, Ioana; Sutter, John P; Sawhney, Kawal; Fermé, Jean Jacques; Thellièr, Christophe; Peverini, Luca

2015-01-01

Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the `junction effect': a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼ 0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts.

Characterization of Sb-doped Bi(2)UO(6) solid solutions by X-ray diffraction and X-ray absorption spectroscopy.

PubMed

Misra, N L; Yadav, A K; Dhara, Sangita; Mishra, S K; Phatak, Rohan; Poswal, A K; Jha, S N; Sinha, A K; Bhattacharyya, D

2013-01-01

The preparation and characterization of Sb-doped Bi(2)UO(6) solid solutions, in a limited composition range, is reported for the first time. The solid solutions were prepared by solid-state reactions of Bi(2)O(3), Sb(2)O(3) and U(3)O(8) in the required stoichiometry. The reaction products were characterized by X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) measurements at the Bi and U L(3) edges. The XRD patterns indicate the precipitation of additional phases in the samples when Sb doping exceeds 4 at%. The chemical shifts of the Bi absorption edges in the samples, determined from the XANES spectra, show a systematic variation only up to 4 at% of Sb doping and support the results of XRD measurements. These observations are further supported by the local structure parameters obtained by analysis of the EXAFS spectra. The local structure of U is found to remain unchanged upon Sb doping indicating that Sb(+3) ions replace Bi(+3) during the doping of Bi(2)UO(6) by Sb.

Development, beam characterization and chromosomal effectiveness of X-rays of RBC characteristic X-ray generator.

PubMed

Endo, Satoru; Hoshi, Masaharu; Takada, Jun; Takatsuji, Toshihiro; Ejima, Yosuke; Saigusa, Shin; Tachibana, Akira; Sasaki, Masao S

2006-06-01

A characteristic hot-filament type X-ray generator was constructed for irradiation of cultured cells. The source provides copper K, iron K, chromium K, molybdenum L, aluminium K and carbon K shell characteristic X-rays. When cultured mouse m5S cells were irradiated and frequencies of dicentrics were fitted to a linear-quadratic model, Y = alphaD + betaD2, the chromosomal effectiveness was not a simple function of photon energy. The alpha-terms increased with the decrease of the photon energy and then decreased with further decrease of the energy with an inflection point at around 10 keV. The beta-terms stayed constant for the photon energy down to 10 keV and then increased with further decrease of energy. Below 10 keV, the relative biological effectiveness (RBE) at low doses was proportional to the photon energy, which contrasted to that for high energy X- or gamma-rays where the RBE was inversely related with the photon energy. The reversion of the energy dependency occurred at around 1-2 Gy, where the RBE of soft X-rays was insensitive to X-ray energy. The reversion of energy-RBE relation at a moderate dose may shed light on the controversy on energy dependency of RBE of ultrasoft X-rays in cell survival experiments.

Crystallographic Characterization of Extraterrestrial Materials by Energy-Scanning X-ray Diffraction

NASA Technical Reports Server (NTRS)

Hagiya, Kenji; Mikouchi, Takashi; Ohsumi, Kazumasa; Terada, Yasuko; Yagi, Naoto; Komatsu, Mutsumi; Yamaguchi, Shoki; Hirata, Arashi; Kurokawa, Ayaka; Zolensky, Michael E. (Principal Investigator)

2016-01-01

We have continued our long-term project using X-ray diffraction to characterize a wide range of extraterrestrial samples. The stationary sample method with polychromatic X-rays is advantageous because the irradiated area of the sample is always same and fixed, meaning that all diffraction spots occur from the same area of the sample, however, unit cell parameters cannot be directly obtained by this method though they are very important for identification of mineral and for determination of crystal structures. In order to obtain the cell parameters even in the case of the sample stationary method, we apply energy scanning of a micro-beam of monochromatic SR at SPring-8.

X-ray Reflectivity Study of Ionic Liquids at Electrified Surfaces

NASA Astrophysics Data System (ADS)

Chu, Miaoqi

X-ray reflectivity (XRR) versatile technique that characterize the surface structures. However, due to the lack of phase information of X-ray data, the reconstruction of electron density profile (EDP) from XRR data is an ill-posed inverse problem that requires extra attention. In Chapter 1, several key concepts in XRR data analysis are reviewed. The typical XRR data acquisition procedure and methods of modeling electron density are introduced. The widely used logarithm form of merit function is justified with mathematical deduction and numerical experiment. A scheme that generates artificial reflectivity data with theoretical statistical error but not systematical error is proposed. With the methods and schemes described in Chapter 1, simulated reflectivity data of a simple one-slab model is generated and fitted to test the efficient of EDP reconstruction. By isolating the parameters, the effects of slab width, electron density contrast and maximal wave transfer are studied individually. It?s demonstrated that best-fit/global minima, result reported by most XRR studies, don?t necessary reflect the real EDP. By contrast, mapping the merit function in the parametric space can capture much more details. Additionally, the widely accepted concept about the XRR theoretical spatial resolution (pi/q_{max}) as well the using Patterson function are brought to test. In the perspective of XRR data analysis, this chapter puts forward general rules to design and optimize XRR experiments. It also demonstrates how susceptible the fitting result will be if it?s not done carefully. In Chapter 3, the interface between hydrophobic OTS film and several solvents is studied with XRR in a transmission-cell setup. The solvents, from water, acetone, to alcohol (methanol, ethanol, 1-propanol), to alkane (pentane, hexane and heptane), vary significantly in terms of polarity and hydrogen bonding. However, the XRR data from different solvents are subtle. The methods and principles elicited in

Ronchi test for characterization of X-ray nanofocusing optics and beamlines.

PubMed

Uhlén, Fredrik; Rahomäki, Jussi; Nilsson, Daniel; Seiboth, Frank; Sanz, Claude; Wagner, Ulrich; Rau, Christoph; Schroer, Christian G; Vogt, Ulrich

2014-09-01

A Ronchi interferometer for hard X-rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X-ray optics: a compound refractive lens and a zone plate.

Surface Morphology of Liquid and Solid Thin Films via X-Ray Reflectivity.

NASA Astrophysics Data System (ADS)

Shindler, Joseph Daniel

X-ray reflectivity can be used to measure the spatial variations in the electron density on length scales from Angstroms to microns. It is sensitive to atomic scale roughness, interdiffusion in buried layers, the thickness of multilayer stacks, and in-plane correlations in each of these cases. We have pioneered the use of a high intensity, moderate resolution configuration for x-ray reflectivity which utilizes a bent crystal graphite monochromator. With this technique we can obtain a beam intensity one hundred times greater than is possible using the high resolution rotating anode configuration, while we have shown that the resulting instrumental resolution is appropriate for the vast majority of thin film work. For all of the systems studied, we were able to measure the weak diffuse scattering signal to probe the in-plane length scales of interfacial roughness, a measurement which had previously only been attempted at synchrotron sources. Studied systems include thin films and surfaces with a wide range of structural order and surface morphologies. Interest in liquid films has been of a fundamental nature. Theories on the expected film evolution with changing thickness and temperature are currently being tested with scattering experiments. We have pursued the issues of film/substrate wetting and conformality, focussing on the temperature dependence of these phenomena near the triple point. Despite the heterogeneity of the substrate potential, we see a very sharp wetting transition at or near the triple point, although below the triple point the film is still smooth, consistent with a uniform layer. We also see a loss of conformality as the fluid films thicken; this is consistent with theory and with other recent experiments. The properties of a multilayer solid film depend not only on the magnitude of the roughness of each interface, but also on the conformality between interfaces and the length scales of the roughness--i.e., whether the roughness is on the atomic

X-ray lithography using holographic images

DOEpatents

Howells, Malcolm R.; Jacobsen, Chris

1995-01-01

A non-contact X-ray projection lithography method for producing a desired X-ray image on a selected surface of an X-ray-sensitive material, such as photoresist material on a wafer, the desired X-ray image having image minimum linewidths as small as 0.063 .mu.m, or even smaller. A hologram and its position are determined that will produce the desired image on the selected surface when the hologram is irradiated with X-rays from a suitably monochromatic X-ray source of a selected wavelength .lambda.. On-axis X-ray transmission through, or off-axis X-ray reflection from, a hologram may be used here, with very different requirements for monochromaticity, flux and brightness of the X-ray source. For reasonable penetration of photoresist materials by X-rays produced by the X-ray source, the wavelength X, is preferably chosen to be no more than 13.5 nm in one embodiment and more preferably is chosen in the range 1-5 nm in the other embodiment. A lower limit on linewidth is set by the linewidth of available microstructure writing devices, such as an electron beam.

The X-Ray Reflection Spectrum of the Radio-Loud Quasar 4C 74.26

NASA Technical Reports Server (NTRS)

Lohfink, Ann M.; Fabian, Andrew C.; Ballantyne, David R.; Boggs, S. E.; Boorman, Peter; Christensen, F. E.; Craig, W. W.; Farrah, Duncan; Garcia, Javier; Hailey, C. J.;

The X-Ray Reflection Spectrum of the Radio-loud Quasar 4C 74.26

NASA Astrophysics Data System (ADS)

Lohfink, Anne M.; Fabian, Andrew C.; Ballantyne, David R.; Boggs, S. E.; Boorman, Peter; Christensen, F. E.; Craig, W. W.; Farrah, Duncan; García, Javier; Hailey, C. J.; Harrison, F. A.; Ricci, Claudio; Stern, Daniel; Zhang, W. W.

2017-06-01

The relativistic jets created by some active galactic nuclei are important agents of AGN feedback. In spite of this, our understanding of what produces these jets is still incomplete. X-ray observations, which can probe the processes operating in the central regions in the immediate vicinity of the supermassive black hole, the presumed jet launching point, are potentially particularly valuable in illuminating the jet formation process. Here, we present the hard X-ray NuSTAR observations of the radio-loud quasar 4C 74.26 in a joint analysis with quasi-simultaneous, soft X-ray Swift observations. Our spectral analysis reveals a high-energy cutoff of {183}-35+51 keV and confirms the presence of ionized reflection in the source. From the average spectrum we detect that the accretion disk is mildly recessed, with an inner radius of R in = 4-180 R g. However, no significant evolution of the inner radius is seen during the three months covered by our NuSTAR campaign. This lack of variation could mean that the jet formation in this radio-loud quasar differs from what is observed in broad-line radio galaxies.

CHARACTERIZATION OF CHROMIUM-CONTAMINATED SOILS USING FIELD-PORTABLE X-RAY FLUORESCENCE

EPA Science Inventory

A detailed characterization of the underlying and adjacent soils near a chrome plating shop utilized field-portable X- ray fluorescence (XRF) as a screening tool. XRF permitted real-time acquisition of estimates for total metal content of soils. A trailer-mounted soil coring unit...

X-rays and gamma-rays from accretion flows onto black holes in Seyferts and X-ray binaries

NASA Technical Reports Server (NTRS)

Zdziarski, Andrzej A.; Johnson, W. Neil; Poutanen, Juri; Magdziarz, Pawel; Gierlinski, Marek

1997-01-01

Observations and theoretical models of X-ray/gamma ray spectra of radio quiet Seyfert galaxies and Galactic black hole candidates are reviewed. The spectra from these objects share the following characteristics: an underlying power law with a high energy cutoff above 200 keV; a Compton reflection component with a Fe K alpha line, and a low energy absorption by intervening cold matter. The X-ray energy spectral index, alpha, is typically in the range between 0.8 and 1 in Seyfert spectra, and that of the hard state spectra of the black hole candidates Cygnus X-1 and GX 339-4 is typically between 0.6 and 0.8. The Compton reflection component corresponds with cold matter covering a solid angle of between 0.8pi and 2pi as seen from the X-ray source. The broadband spectra of both classes of sources are well fitted by Compton upscattering of soft photons in thermal plasma. The fits yield a thermal plasma temperature of 100 keV and the Thomson optical depth of 1. All the spectra presented are cut off before the electron rest energy 511 keV, indicating that electron/positron pair production is an important process.

MeV per Nucleon Ion Irradiation of Nuclear Materials with High Energy Synchrotron X-ray Characterization

DOE PAGES

Pellin, M. J.; Yacout, Abdellatif M.; Mo, Kun; ...

2016-01-14

The combination of MeV/Nucleon ion irradiation (e.g. 133 MeV Xe) and high energy synchrotron x-ray characterization (e.g. at the Argonne Advanced Photon Source, APS) provides a powerful characterization method to understand radiation effects and to rapidly screen materials for the nuclear reactor environment. Ions in this energy range penetrate ~10 μm into materials. Over this range, the physical interactions vary (electronic stopping, nuclear stopping and added interstitials). Spatially specific x-ray (and TEM and nanoindentation) analysis allow individual quantification of these various effects. Hard x-rays provide the penetration depth needed to analyze even nuclear fuels. Here, this combination of synchrotron x-raymore » and MeV/Nucleon ion irradiation is demonstrated on U-Mo fuels. A preliminary look at HT-9 steels is also presented. We suggest that a hard x-ray facility with in situ MeV/nucleon irradiation capability would substantially accelerate the rate of discovery for extreme materials.« less

An X-Ray/SDSS Sample: Observational Characterization of The Outflowing Gas

NASA Astrophysics Data System (ADS)

Perna, Michele; Brusa, M.; Lanzuisi, G.; Mignoli, M.

2016-10-01

Powerful ionised AGN-driven outflows, commonly detected both locally and at high redshift, are invoked to contribute to the co-evolution of SMBH and galaxies through feedback phenomena. Our recent works (Brusa+2015; 2016; Perna+2015a,b) have shown that the XMM-COSMOS targets with evidence of outflows collected so far ( 10 sources) appear to be associated with low X-ray kbol corrections (Lbol /LX ˜ 18), in spite of their spread in obscuration, in the locations on the SFR-Mstar diagram, in their radio emission. A higher statistical significance is required to validate a connection between outflow phenomena and a X-ray loudness. Moreover, in order to validate their binding nature to the galaxy fate, it is crucial to correctly determine the outflow energetics. This requires time consuming integral field spectroscopic (IFS) observations, which are, at present, mostly limited to high luminosity objectsThe study of SDSS data offers a complementary strategy to IFS efforts. I will present physical and demographic characterization of the AGN-galaxy system during the feedback phase obtained studying a sample of 500 X-ray/SDSS AGNs, at z<0.8. Outflow velocity inferred from [OIII]5007 emission line profile has been related to optical (e.g., [OIII] and bolometric luminosities, Eddington ratio, stellar velocity dispersion) and X-ray properties (intrinsic X-ray luminosity, obscuration and X-ray kbol correction), to determine what drives ionised winds. Several diagnostic line ratios have been used to infer the physical properties of the ionised outflowing gas. The knowledge of these properties can reduce the actual uncertainties in the outflow energetics by a factor of ten, pointing to improve our understanding of the AGN outflow phenomenon and its impact on galaxy evolution.

X-ray diffraction from flight muscle with a headless myosin mutation: implications for interpreting reflection patterns

PubMed Central

Iwamoto, Hiroyuki; Trombitás, Károly; Yagi, Naoto; Suggs, Jennifer A.; Bernstein, Sanford I.

2014-01-01

Fruit fly (Drosophila melanogaster) is one of the most useful animal models to study the causes and effects of hereditary diseases because of its rich genetic resources. It is especially suitable for studying myopathies caused by myosin mutations, because specific mutations can be induced to the flight muscle-specific myosin isoform, while leaving other isoforms intact. Here we describe an X-ray-diffraction-based method to evaluate the structural effects of mutations in contractile proteins in Drosophila indirect flight muscle. Specifically, we describe the effect of the headless myosin mutation, Mhc10-Y97, in which the motor domain of the myosin head is deleted, on the X-ray diffraction pattern. The loss of general integrity of the filament lattice is evident from the pattern. A striking observation, however, is the prominent meridional reflection at d = 14.5 nm, a hallmark for the regularity of the myosin-containing thick filament. This reflection has long been considered to arise mainly from the myosin head, but taking the 6th actin layer line reflection as an internal control, the 14.5-nm reflection is even stronger than that of wild-type muscle. We confirmed these results via electron microscopy, wherein image analysis revealed structures with a similar periodicity. These observations have major implications on the interpretation of myosin-based reflections. PMID:25400584

Characterization of SiGe thin films using a laboratory X-ray instrument

PubMed Central

Ulyanenkova, Tatjana; Myronov, Maksym; Benediktovitch, Andrei; Mikhalychev, Alexander; Halpin, John; Ulyanenkov, Alex

2013-01-01

The technique of reciprocal space mapping using X-rays is a recognized tool for the nondestructive characterization of epitaxial films. X-ray scattering from epitaxial Si0.4Ge0.6 films on Si(100) substrates using a laboratory X-ray source was investigated. It is shown that a laboratory source with a rotating anode makes it possible to investigate the material parameters of the super-thin 2–6 nm layers. For another set of partially relaxed layers, 50–200 nm thick, it is shown that from a high-resolution reciprocal space map, conditioned from diffuse scattering on dislocations, it is possible to determine quantitatively from the shape of a diffraction peak (possessing no thickness fringes) additional parameters such as misfit dislocation density and layer thickness as well as concentration and relaxation. PMID:24046495

SARS E protein in phospholipid bilayers: an anomalous X-ray reflectivity study

NASA Astrophysics Data System (ADS)

Khattari, Z.; Brotons, G.; Arbely, E.; Arkin, I. T.; Metzger, T. H.; Salditt, T.

2005-02-01

We report on an anomalous X-ray reflectivity study to locate a labelled residue of a membrane protein with respect to the lipid bilayer. From such experiments, important constraints on the protein or peptide conformation can be derived. Specifically, our aim is to localize an iodine-labelled phenylalanine in the SARS E protein, incorporated in DMPC phospholipid bilayers, which are deposited in the form of thick multilamellar stacks on silicon surfaces. Here, we discuss the experimental aspects and the difficulties associated with the Fourier synthesis analysis that gives the electron density profile of the membranes.

X-ray diffraction and X-ray standing-wave study of the lead stearate film structure

DOE Office of Scientific and Technical Information (OSTI.GOV)

Blagov, A. E.; Dyakova, Yu. A.; Kovalchuk, M. V.

2016-05-15

A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer ofmore » the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.« less

Novel ultra-lightweight and high-resolution MEMS x-ray optics

NASA Astrophysics Data System (ADS)

Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Takagi, Utako; Mita, Makoto; Riveros, Raul; Yamaguchi, Hitomi; Kato, Fumiki; Sugiyama, Susumu; Fujiwara, Kouzou; Morishita, Kohei; Nakajima, Kazuo; Fujihira, Shinya; Kanamori, Yoshiaki; Yamasaki, Noriko Y.; Mitsuda, Kazuhisa; Maeda, Ryutaro

2009-05-01

We have been developing ultra light-weight X-ray optics using MEMS (Micro Electro Mechanical Systems) technologies.We utilized crystal planes after anisotropic wet etching of silicon (110) wafers as X-ray mirrors and succeeded in X-ray reflection and imaging. Since we can etch tiny pores in thin wafers, this type of optics can be the lightest X-ray telescope. However, because the crystal planes are alinged in certain directions, we must approximate ideal optical surfaces with flat planes, which limits angular resolution of the optics on the order of arcmin. In order to overcome this issue, we propose novel X-ray optics based on a combination of five recently developed MEMS technologies, namely silicon dry etching, X-ray LIGA, silicon hydrogen anneal, magnetic fluid assisted polishing and hot plastic deformation of silicon. In this paper, we describe this new method and report on our development of X-ray mirrors fabricated by these technologies and X-ray reflection experiments of two types of MEMS X-ray mirrors made of silicon and nickel. For the first time, X-ray reflections on these mirrors were detected in the angular response measurements. Compared to model calculations, surface roughness of the silicon and nickel mirrors were estimated to be 5 nm and 3 nm, respectively.

Compton Reflection in AGN with Simbol-X

NASA Astrophysics Data System (ADS)

Beckmann, V.; Courvoisier, T. J.-L.; Gehrels, N.; Lubiński, P.; Malzac, J.; Petrucci, P. O.; Shrader, C. R.; Soldi, S.

2009-05-01

AGN exhibit complex hard X-ray spectra. Our current understanding is that the emission is dominated by inverse Compton processes which take place in the corona above the accretion disk, and that absorption and reflection in a distant absorber play a major role. These processes can be directly observed through the shape of the continuum, the Compton reflection hump around 30 keV, and the iron fluorescence line at 6.4 keV. We demonstrate the capabilities of Simbol-X to constrain complex models for cases like MCG-05-23-016, NGC 4151, NGC 2110, and NGC 4051 in short (10 ksec) observations. We compare the simulations with recent observations on these sources by INTEGRAL, Swift and Suzaku. Constraining reflection models for AGN with Simbol-X will help us to get a clear view of the processes and geometry near to the central engine in AGN, and will give insight to which sources are responsible for the Cosmic X-ray background at energies >20 keV.

Assessment study of ion-exchange chromatography combined with solution X-ray scattering measurement for protein characterization.

PubMed

Watanabe, Yasushi

2018-03-02

The performance of ion-exchange chromatography combined with small-angle X-ray scattering measurement was evaluated by characterization of the hen egg white lysozyme as a model protein. The X-ray transmittance was estimated using a micro-ionization chamber equipped with a sample cell holder for the real-time monitoring of the X-ray beam strength through the salt gradient elution. The radius of gyration of the eluted protein was estimated to be 1.50 ± 0.06 (n = 3) nm and 1.4 ± 0.1 nm as the value at the zero protein concentration. By using the X-ray transmittance values for the scattering intensity correction, the molecular weight of the eluted protein was estimated to be 15,200 ± 500 (n = 3) and 14,400 ± 200 as the value at the zero protein concentration. These values are close to those of the monomer of this protein. The ion-exchange chromatography combined with the small-angle X-ray scattering measurement system equipped with the X-ray transmittance monitor is a reliable method for protein characterization in solution. Copyright © 2018 Elsevier B.V. All rights reserved.

X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography; Proceedings of the Meeting, San Diego, CA, July 9-13, 1990

NASA Technical Reports Server (NTRS)

Hoover, Richard B. (Editor); Walker, Arthur B. C., Jr. (Editor)

1991-01-01

Topics discussed in this issue include the fabrication of multilayer X-ray/EUV coatings; the design, characterization, and test of multilayer X-ray/EUV coatings; multilayer X-ray/EUV monochromators and imaging microscopes; X-ray/EUV telescopes; the test and calibration performance of X-ray/EUV instruments; XUV/soft X-ray projection lithography; X-ray/EUV space observatories and missions; X-ray/EUV telescopes for solar research; X-ray/EUV polarimetry; X-ray/EUV spectrographs; and X-ray/EUV filters and gratings. Papers are presented on the deposition-controlled uniformity of multilayer mirrors, interfaces in Mo/Si multilayers, the design and analysis of an aspherical multilayer imaging X-ray microscope, recent developments in the production of thin X-ray reflecting foils, and the ultraprecise scanning technology. Consideration is also given to an active sun telescope array, the fabrication and performance at 1.33 nm of a 0.24-micron-period multilayer grating, a cylindrical proportional counter for X-ray polarimetry, and the design and analysis of the reflection grating arrays for the X-Ray Multi-Mirror Mission.

Polarimeter for Low Energy X-ray Astrophysical Sources (PLEXAS)

NASA Technical Reports Server (NTRS)

Murray, Stephen S.; Pierce, David L. (Technical Monitor)

2002-01-01

The Polarimeter for Low Energy X-ray Astrophysical Sources (PLEXAS) is an astrophysics mission concept for measuring the polarization of X-ray sources at low energies below the C-K band (less than 277 eV). PLEXAS uses the concept of variations in the reflectivity of a multilayered X-ray telescope as a function of the orientation of an X-rays polarization vector with respect to the reflecting surface of the optic. By selecting an appropriate multilayer, and rotating the X-ray telescope while pointing to a source, there will be a modulation in the source intensity, as measured at the focus of the telescope, which is proportional to the degree of polarization in the source.

REDSoX: Monte-Carlo ray-tracing for a soft x-ray spectroscopy polarimeter

NASA Astrophysics Data System (ADS)

Günther, Hans M.; Egan, Mark; Heilmann, Ralf K.; Heine, Sarah N. T.; Hellickson, Tim; Frost, Jason; Marshall, Herman L.; Schulz, Norbert S.; Theriault-Shay, Adam

2017-08-01

X-ray polarimetry offers a new window into the high-energy universe, yet there has been no instrument so far that could measure the polarization of soft X-rays (about 17-80 Å) from astrophysical sources. The Rocket Experiment Demonstration of a Soft X-ray Polarimeter (REDSoX Polarimeter) is a proposed sounding rocket experiment that uses a focusing optic and splits the beam into three channels. Each channel has a set of criticalangle transmission (CAT) gratings that disperse the x-rays onto a laterally graded multilayer (LGML) mirror, which preferentially reflects photons with a specific polarization angle. The three channels are oriented at 120 deg to each other and thus measure the three Stokes parameters: I, Q, and U. The period of the LGML changes with position. The main design challenge is to arrange the gratings so that they disperse the spectrum in such a way that all rays are dispersed onto the position on the multi-layer mirror where they satisfy the local Bragg condition despite arriving on the mirror at different angles due to the converging beam from the focusing optics. We present a polarimeteric Monte-Carlo ray-trace of this design to assess non-ideal effects from e.g. mirror scattering or the finite size of the grating facets. With mirror properties both simulated and measured in the lab for LGML mirrors of 80-200 layers we show that the reflectivity and the width of the Bragg-peak are sufficient to make this design work when non-ideal effects are included in the simulation. Our simulations give us an effective area curve, the modulation factor and the figure of merit for the REDSoX polarimeter. As an example, we simulate an observation of Mk 421 and show that we could easily detect a 20% linear polarization.

X-ray scattering study

NASA Technical Reports Server (NTRS)

Wriston, R. S.; Froechtenigt, J. F.

1972-01-01

A soft X-ray glancing incidence telescope mirror and a group of twelve optical flat samples were used to study the scattering of X-rays. The mirror was made of Kanigen coated beryllium and the images produced were severely limited by scattering of X-rays. The best resolution attained was about fifteen arc seconds. The telescope efficiency was found to be 0.0006. The X-ray beam reflected from the twelve optical flat samples was analyzed by means of a long vacuum system of special design for these tests. The scattering then decreased with increasing angle of incidence until a critical angle was passed. At larger angles the scattering increased again. The samples all scattered more at 44 A than at 8 A. Metal samples were found to have about the same scattering at 44 A but greater scattering at 8 A than glass samples.

NUSTAR and SUZAKU X-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

DOE PAGES

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.; ...

2015-06-15

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spinmore » $$a\\gt 0.9$$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. As a result, we discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.« less

NUSTAR and SUZAKU X-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

DOE Office of Scientific and Technical Information (OSTI.GOV)

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spinmore » $$a\\gt 0.9$$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. As a result, we discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.« less

Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay.

PubMed

Gong, Zhiliang; Kerr, Daniel; Hwang, Hyeondo Luke; Henderson, J Michael; Suwatthee, Tiffany; Slaw, Benjamin R; Cao, Kathleen D; Lin, Binhua; Bu, Wei; Lee, Ka Yee C

2017-03-01

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared to literature results. In an air/liquid interface study, Ca 2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl 2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm 2 of interfacial area contains 2.38 ± 0.06 Ca 2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca 2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr 2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr 2+ at 68 -5 +6 Å 2 per ion, consistent with the result published for the same dataset.

Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

NASA Astrophysics Data System (ADS)

Gong, Zhiliang; Kerr, Daniel; Hwang, Hyeondo Luke; Henderson, J. Michael; Suwatthee, Tiffany; Slaw, Benjamin R.; Cao, Kathleen D.; Lin, Binhua; Bu, Wei; Lee, Ka Yee C.

2017-03-01

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared to literature results. In an air/liquid interface study, Ca2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm2 of interfacial area contains 2.38 ± 0.06 Ca2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr2+ at 68-5+6 Å2 per ion, consistent with the result published for the same dataset.

Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

DOE Office of Scientific and Technical Information (OSTI.GOV)

Gong, Zhiliang; Kerr, Daniel; Hwang, Hyeondo Luke

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared tomore » literature results. In an air/liquid interface study, Ca2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm2 of interfacial area contains 2.38 ± 0.06 Ca2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr2+ at 68+6-568-5+6 Å2 per ion, consistent with the result published for the same dataset.« less

Probing Ultrafast Electron Dynamics at Surfaces Using Soft X-Ray Transient Reflectivity Spectroscopy

NASA Astrophysics Data System (ADS)

Baker, L. Robert; Husek, Jakub; Biswas, Somnath; Cirri, Anthony

The ability to probe electron dynamics with surface sensitivity on the ultrafast time scale is critical for understanding processes such as charge separation, injection, and surface trapping that mediate efficiency in catalytic and energy conversion materials. Toward this goal, we have developed a high harmonic generation (HHG) light source for femtosecond soft x-ray reflectivity. Using this light source we investigated the ultrafast carrier dynamics at the surface of single crystalline α-Fe2O3, polycrystalline α-Fe2O3, and the mixed metal oxide, CuFeO2. We have recently demonstrated that CuFeO2 in particular is a selective catalyst for photo-electrochemical CO2 reduction to acetate; however, the role of electronic structure and charge carrier dynamics in mediating catalytic selectivity has not been well understood. Soft x-ray reflectivity measurements probe the M2,3, edges of the 3d transition metals, which provide oxidation and spin state resolution with element specificity. In addition to chemical state specificity, these measurements are also surface sensitive, and by independently simulating the contributions of the real and imaginary components of the complex refractive index, we can differentiate between surface and sub-surface contributions to the excited state spectrum. Accordingly, this work demonstrates the ability to probe ultrafast carrier dynamics in catalytic materials with element and chemical state specificity and with surface sensitivity.

Reconstitution of SNARE proteins into solid-supported lipid bilayer stacks and X-ray structure analysis.

PubMed

Xu, Yihui; Kuhlmann, Jan; Brennich, Martha; Komorowski, Karlo; Jahn, Reinhard; Steinem, Claudia; Salditt, Tim

2018-02-01

SNAREs are known as an important family of proteins mediating vesicle fusion. For various biophysical studies, they have been reconstituted into supported single bilayers via proteoliposome adsorption and rupture. In this study we extended this method to the reconstitution of SNAREs into supported multilamellar lipid membranes, i.e. oriented multibilayer stacks, as an ideal model system for X-ray structure analysis (X-ray reflectivity and diffraction). The reconstitution was implemented through a pathway of proteomicelle, proteoliposome and multibilayer. To monitor the structural evolution in each step, we used small-angle X-ray scattering for the proteomicelles and proteoliposomes, followed by X-ray reflectivity and grazing-incidence small-angle scattering for the multibilayers. Results show that SNAREs can be successfully reconstituted into supported multibilayers, with high enough orientational alignment for the application of surface sensitive X-ray characterizations. Based on this protocol, we then investigated the effect of SNAREs on the structure and phase diagram of the lipid membranes. Beyond this application, this reconstitution protocol could also be useful for X-ray analysis of many further membrane proteins. Copyright © 2017 Elsevier B.V. All rights reserved.

X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

PubMed Central

Liu, J. P.; Kirchhoff, J.; Zhou, L.; Zhao, M.; Grapes, M. D.; Dale, D. S.; Tate, M. D.; Philipp, H. T.; Gruner, S. M.; Weihs, T. P.; Hufnagel, T. C.

2017-01-01

A technique for measuring interdiffusion in multilayer materials during rapid heating using X-ray reflectivity is described. In this technique the sample is bent to achieve a range of incident angles simultaneously, and the scattered intensity is recorded on a fast high-dynamic-range mixed-mode pixel array detector. Heating of the multilayer is achieved by electrical resistive heating of the silicon substrate, monitored by an infrared pyrometer. As an example, reflectivity data from Al/Ni heated at rates up to 200 K s−1 are presented. At short times the interdiffusion coefficient can be determined from the rate of decay of the reflectivity peaks, and it is shown that the activation energy for interdiffusion is consistent with a grain boundary diffusion mechanism. At longer times the simple analysis no longer applies because the evolution of the reflectivity pattern is complicated by other processes, such as nucleation and growth of intermetallic phases. PMID:28664887

X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

DOE PAGES

Liu, J. P.; Kirchhoff, J.; Zhou, L.; ...

2017-06-15

A technique for measuring interdiffusion in multilayer materials during rapid heating using X-ray reflectivity is described. In this technique the sample is bent to achieve a range of incident angles simultaneously, and the scattered intensity is recorded on a fast high-dynamic-range mixed-mode pixel array detector. Heating of the multilayer is achieved by electrical resistive heating of the silicon substrate, monitored by an infrared pyrometer. As an example, reflectivity data from Al/Ni heated at rates up to 200 K s -1 are presented. At short times the interdiffusion coefficient can be determined from the rate of decay of the reflectivity peaks,more » and it is shown that the activation energy for interdiffusion is consistent with a grain boundary diffusion mechanism. At longer times the simple analysis no longer applies because the evolution of the reflectivity pattern is complicated by other processes, such as nucleation and growth of intermetallic phases.« less

Fabrication and characterization of environmental-friendly Ni1-xRxTiO3 nanopigments with high NIR reflectance

NASA Astrophysics Data System (ADS)

Tong, Yu-Ping; Chen, Zheng; Wang, Hui-Xian; Zhang, Xu-Fang; Ma, Jun-Tao; Chen, Xi

2015-04-01

A series of novel high dispersed environmental-friendly nanopigments based on NiTiO3 doped with rare earth ion such as Y, La, Eu, Sm have been developed. The products were characterized by X-ray diffractometer (XRD), scanning electron microscopy (SEM), commission internationale de l'Eclairage (CIE) 1976 L*α*b* color scales and UV-Vis-near-infrared radiation (NIR) reflectance spectroscopy. The substitution of R3+ for Ni2+ in NiTiO3 can improve the yellowness of pigments, especially for Eu3+ substitution. The sample with the substitution of Eu3+ for Ni2+ processes the highest NIR reflectance and enhances the NIR reflectance to 89.0%. SEM results revealed that the obtained pigments were composed of well-dispersed spherical-like particles with the range of 40-60 nm. EDS results indicated that the distribution of Ni, Ti, R, O element was considerably uniform with no chemical segregation phenomenon.

History of Chandra X-Ray Observatory

NASA Image and Video Library

2000-04-01

This Chandra X-Ray Observatory (CXO) image is a spectrum of a black hole, which is similar to the colorful spectrum of sunlight produced by a prism. The x-rays of interest are shown here recorded in bright stripes that run rightward and leftward from the center of the image. These x-rays are sorted precisely according to their energy with the highest-energy x-rays near the center of the image and the lower-energy x-rays farther out. The spectrum was obtained by using the Low Energy Transmission Grating (LETG), which intercepts x-rays and changes their direction by the amounts that depend sensitively on the x-ray energy. The assembly holds 540 gold transmission gratings. When in place behind the mirrors, the gratings intercept the x-rays reflected from the telescope. The bright spot at the center is due to a fraction of the x-ray radiation that is not deflected by the LETG. The spokes that intersect the central spot and the faint diagonal rays that flank the spectrum itself are artifacts due to the structure that supports the LETG grating elements. (Photo credit: NASA Cfa/J. McClintock et al)

NuSTAR and Suzaku X-ray Spectroscopy of NGC 4151: Evidence for Reflection from the Inner Accretion Disk

NASA Astrophysics Data System (ADS)

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.; Bauer, F.; Boggs, S. E.; Christensen, F. E.; Craig, W. W.; Dauser, T.; Elvis, M.; Fabian, A. C.; Fuerst, F.; García, J.; Grefenstette, B. W.; Hailey, C. J.; Harrison, F. A.; Madejski, G.; Marinucci, A.; Matt, G.; Reynolds, C. S.; Stern, D.; Walton, D. J.; Zoghbi, A.

2015-06-01

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spin a\\gt 0.9 accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. We discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.

Multilayer X-ray imaging systems

NASA Astrophysics Data System (ADS)

Shealy, D. L.; Hoover, R. B.; Gabardi, D. R.

1986-01-01

An assessment of the imaging properties of multilayer X-ray imaging systems with spherical surfaces has been made. A ray trace analysis was performed to investigate the effects of using spherical substrates (rather than the conventional paraboloidal/hyperboloidal contours) for doubly reflecting Cassegrain telescopes. These investigations were carried out for mirrors designed to operate at selected soft X-ray/XUV wavelengths that are of significance for studies of the solar corona/transition region from the Stanford/MSFC Rocket X-Ray Telescope. The effects of changes in separation of the primary and secondary elements were also investigated. These theoretical results are presented as well as the results of ray trace studies to establish the resolution and vignetting effects as a function of field angle and system parameters.

Reprint of: Combining theory and experiment for X-ray absorption spectroscopy and resonant X-ray scattering characterization of polymers

DOE PAGES

Su, Gregory M.; Cordova, Isvar A.; Brady, Michael A.; ...

2016-11-01

An improved understanding of fundamental chemistry, electronic structure, morphology, and dynamics in polymers and soft materials requires advanced characterization techniques that are amenable to in situ and operando studies. Soft X-ray methods are especially useful in their ability to non-destructively provide information on specific materials or chemical moieties. Analysis of these experiments, which can be very dependent on X-ray energy and polarization, can quickly become complex. Complementary modeling and predictive capabilities are required to properly probe these critical features. Here in this paper, we present relevant background on this emerging suite of techniques. We focus on how the combination ofmore » theory and experiment has been applied and can be further developed to drive our understanding of how these methods probe relevant chemistry, structure, and dynamics in soft materials.« less

Quantitative electron density characterization of soft tissue substitute plastic materials using grating-based x-ray phase-contrast imaging

DOE Office of Scientific and Technical Information (OSTI.GOV)

Sarapata, A.; Chabior, M.; Zanette, I.

2014-10-15

Many scientific research areas rely on accurate electron density characterization of various materials. For instance in X-ray optics and radiation therapy, there is a need for a fast and reliable technique to quantitatively characterize samples for electron density. We present how a precise measurement of electron density can be performed using an X-ray phase-contrast grating interferometer in a radiographic mode of a homogenous sample in a controlled geometry. A batch of various plastic materials was characterized quantitatively and compared with calculated results. We found that the measured electron densities closely match theoretical values. The technique yields comparable results between amore » monochromatic and a polychromatic X-ray source. Measured electron densities can be further used to design dedicated X-ray phase contrast phantoms and the additional information on small angle scattering should be taken into account in order to exclude unsuitable materials.« less

The X-Ray Weakness of GPS Radio Galaxies: A Volume-Limited Complete Sample

NASA Technical Reports Server (NTRS)

Mushotzky, Richard F. (Technical Monitor); Siemiginowska, Aneta (Principal Investigator)

2004-01-01

The XMM observations of Mkn 668 have been analyzed. We found soft X-ray signatures of a hot plasma (kT approximately 10^7 approximately K) and a hard X-ray emission from the nucleus. The X-ray spectrum above 2.5 approximately keV is characterized by a very flat (observed photon index, Gamma approximately 0.5) power-law continuum, alongside with a strong Fe-K-alpha neutral iron fluorescent line (EW approximately 600 approximately eV). The best explanation for the origin of this high energy X-ray emission is in terms of the Compton-reflection of the nuclear emission. The primary X-ray emission is obscured by a Compton-thick (N_H approximately 10^24 approximately cm-2) matter which becomes transparent at higher energies. The observed above 2.5-keV X-rays are mostly due to reflection which is indicated by a strong Fe-K-alpha line. This represents the second hard X-ray detection of the GPS galaxy ever (the first one being 1345+125; O Dea et al. 2000). Interestingly, the both such trend is confirmed by our on going XMM-Newton observations of a larger GPS sample, it would lead us to looking into the question on how the dense nuclear environment impacts the nature and evolution of a GPS source, and more generally, on the history of radio power in the universe. The paper summarizing the results has been submitted to Astronomy and Astrophysics in December 2003.

Water window imaging x ray microscope

NASA Technical Reports Server (NTRS)

Hoover, Richard B. (Inventor)

1992-01-01

A high resolution x ray microscope for imaging microscopic structures within biological specimens has an optical system including a highly polished primary and secondary mirror coated with identical multilayer coatings, the mirrors acting at normal incidence. The coatings have a high reflectivity in the narrow wave bandpass between 23.3 and 43.7 angstroms and have low reflectivity outside of this range. The primary mirror has a spherical concave surface and the secondary mirror has a spherical convex surface. The radii of the mirrors are concentric about a common center of curvature on the optical axis of the microscope extending from the object focal plane to the image focal plane. The primary mirror has an annular configuration with a central aperture and the secondary mirror is positioned between the primary mirror and the center of curvature for reflecting radiation through the aperture to a detector. An x ray filter is mounted at the stage end of the microscope, and film sensitive to x rays in the desired band width is mounted in a camera at the image plane of the optical system. The microscope is mounted within a vacuum chamber for minimizing the absorption of x rays in air from a source through the microscope.

On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology

PubMed Central

Siewert, F.; Buchheim, J.; Zeschke, T.; Störmer, M.; Falkenberg, G.; Sankari, R.

2014-01-01

To fully exploit the ultimate source properties of the next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), the quality requirements for gratings and reflective synchrotron optics, especially mirrors, have significantly increased. These coherence-preserving optical components for high-brightness sources will feature nanoscopic shape accuracies over macroscopic length scales up to 1000 mm. To enable high efficiency in terms of photon flux, such optics will be coated with application-tailored single or multilayer coatings. Advanced thin-film fabrication of today enables the synthesis of layers on the sub-nanometre precision level over a deposition length of up to 1500 mm. Specifically dedicated metrology instrumentation of comparable accuracy has been developed to characterize such optical elements. Second-generation slope-measuring profilers like the nanometre optical component measuring machine (NOM) at the BESSY-II Optics laboratory allow the inspection of up to 1500 mm-long reflective optical components with an accuracy better than 50 nrad r.m.s. Besides measuring the shape on top of the coated mirror, it is of particular interest to characterize the internal material properties of the mirror coating, which is the domain of X-rays. Layer thickness, density and interface roughness of single and multilayer coatings are investigated by means of X-ray reflectometry. In this publication recent achievements in the field of slope measuring metrology are shown and the characterization of different types of mirror coating demonstrated. Furthermore, upcoming challenges to the inspection of ultra-precise optical components designed to be used in future FEL and DLSR beamlines are discussed. PMID:25177985

The effect of well-characterized, very low-dose x-ray radiation on fibroblasts

PubMed Central

Truong, Katelyn; Bradley, Suzanne; Baginski, Bryana; Wilson, Joseph R.; Medlin, Donald; Zheng, Leon; Wilson, R. Kevin; Rusin, Matthew; Takacs, Endre

2018-01-01

The purpose of this study is to determine the effects of low-dose radiation on fibroblast cells irradiated by spectrally and dosimetrically well-characterized soft x-rays. To achieve this, a new cell culture x-ray irradiation system was designed. This system generates characteristic fluorescent x-rays to irradiate the cell culture with x-rays of well-defined energies and doses. 3T3 fibroblast cells were cultured in cups with Mylar® surfaces and were irradiated for one hour with characteristic iron (Fe) K x-ray radiation at a dose rate of approximately 550 μGy/hr. Cell proliferation, total protein analysis, flow cytometry, and cell staining were performed on fibroblast cells to determine the various effects caused by the radiation. Irradiated cells demonstrated increased proliferation and protein production compared to control samples. Flow cytometry revealed that a higher percentage of irradiated cells were in the G0/G1 phase of the cell cycle compared to control counterparts, which is consistent with other low-dose studies. Cell staining results suggest that irradiated cells maintained normal cell functions after radiation exposure, as there were no qualitative differences between the images of the control and irradiated samples. The result of this study suggest that low-dose soft x-ray radiation might cause an initial pause, followed by a significant increase, in proliferation. An initial “pause” in cell proliferation could be a protective mechanism of the cells to minimize DNA damage caused by radiation exposure. The new cell irradiation system developed here allows for unprecedented control over the properties of the x-rays given to the cell cultures. This will allow for further studies on various cell types with known spectral distribution and carefully measured doses of radiation, which may help to elucidate the mechanisms behind varied cell responses to low-dose x-rays reported in the literature. PMID:29300773

Cone-beam x-ray luminescence computed tomography based on x-ray absorption dosage

NASA Astrophysics Data System (ADS)

Liu, Tianshuai; Rong, Junyan; Gao, Peng; Zhang, Wenli; Liu, Wenlei; Zhang, Yuanke; Lu, Hongbing

2018-02-01

With the advances of x-ray excitable nanophosphors, x-ray luminescence computed tomography (XLCT) has become a promising hybrid imaging modality. In particular, a cone-beam XLCT (CB-XLCT) system has demonstrated its potential in in vivo imaging with the advantage of fast imaging speed over other XLCT systems. Currently, the imaging models of most XLCT systems assume that nanophosphors emit light based on the intensity distribution of x-ray within the object, not completely reflecting the nature of the x-ray excitation process. To improve the imaging quality of CB-XLCT, an imaging model that adopts an excitation model of nanophosphors based on x-ray absorption dosage is proposed in this study. To solve the ill-posed inverse problem, a reconstruction algorithm that combines the adaptive Tikhonov regularization method with the imaging model is implemented for CB-XLCT reconstruction. Numerical simulations and phantom experiments indicate that compared with the traditional forward model based on x-ray intensity, the proposed dose-based model could improve the image quality of CB-XLCT significantly in terms of target shape, localization accuracy, and image contrast. In addition, the proposed model behaves better in distinguishing closer targets, demonstrating its advantage in improving spatial resolution.

Cone-beam x-ray luminescence computed tomography based on x-ray absorption dosage.

PubMed

Liu, Tianshuai; Rong, Junyan; Gao, Peng; Zhang, Wenli; Liu, Wenlei; Zhang, Yuanke; Lu, Hongbing

2018-02-01

With the advances of x-ray excitable nanophosphors, x-ray luminescence computed tomography (XLCT) has become a promising hybrid imaging modality. In particular, a cone-beam XLCT (CB-XLCT) system has demonstrated its potential in in vivo imaging with the advantage of fast imaging speed over other XLCT systems. Currently, the imaging models of most XLCT systems assume that nanophosphors emit light based on the intensity distribution of x-ray within the object, not completely reflecting the nature of the x-ray excitation process. To improve the imaging quality of CB-XLCT, an imaging model that adopts an excitation model of nanophosphors based on x-ray absorption dosage is proposed in this study. To solve the ill-posed inverse problem, a reconstruction algorithm that combines the adaptive Tikhonov regularization method with the imaging model is implemented for CB-XLCT reconstruction. Numerical simulations and phantom experiments indicate that compared with the traditional forward model based on x-ray intensity, the proposed dose-based model could improve the image quality of CB-XLCT significantly in terms of target shape, localization accuracy, and image contrast. In addition, the proposed model behaves better in distinguishing closer targets, demonstrating its advantage in improving spatial resolution. (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).

Characterizing Complexity of Containerized Cargo X-ray Images

DOE Office of Scientific and Technical Information (OSTI.GOV)

Wang, Guangxing; Martz, Harry; Glenn, Steven

X-ray imaging can be used to inspect cargos imported into the United States. In order to better understand the performance of X-ray inspection systems, the X-ray characteristics (density, complexity) of cargo need to be quantified. In this project, an image complexity measure called integrated power spectral density (IPSD) was studied using both DNDO engineered cargos and stream-of-commerce (SOC) cargos. A joint distribution of cargo density and complexity was obtained. A support vector machine was used to classify the SOC cargos into four categories to estimate the relative fractions.

X-ray source characterization of aluminum X-pinch plasmas driven by the 0. 5 TW LION accelerator

DOE Office of Scientific and Technical Information (OSTI.GOV)

Qi, N.; Hammer, D.A.; Kalantar, D.H.

1989-12-01

Recent experiments at Cornell have been performed to investigate X-pinch plasmas as intense x-ray sources which might be used to pump resonant photoexcitation lasers. Crossed Al wires have been driven by up to 600 kA current for 40 ns. High density bright spots are observed at the crossing point(s). Various diagnostics were used to characterize the X-pinch plasmas as a function of initial mass loading for several specific wire configurations. The optimum mass loading for different ionization stages of Al, and the total x-ray energy yields, which are on the order of hundreds of Joules, were examined. Estimates of plasmamore » density, {similar to}10{sup 20} cm{sup {minus}3}, and temperature, about 400 eV, were obtained.« less

X-ray Hybrid CMOS Detectors : Recent progress in development and characterization

NASA Astrophysics Data System (ADS)

Chattopadhyay, Tanmoy; Falcone, Abraham; Burrows, David N.

2017-08-01

PennState high energy astronomy laboratory has been working on the development and characterization of Hybrid CMOS Detectors (HCDs) for last few years in collaboration with Teledyne Imaging Sensors (TIS). HCDs are preferred over X-ray CCDs due to their higher and flexible read out rate, radiation hardness and low power which make them more suitable for next generation large area X-ray telescopic missions. An H2RG detector with 36 micron pixel pitch and 18 micron ROIC, has been selected for a sounding rocket flight in 2018. The H2RG detector provides ~2.5 % energy resolution at 5.9 keV and ~7 e- read noise when coupled to a cryo-SIDECAR. We could also detect a clear Oxygen line (~0.5 keV) from the detector implying a lower energy threshold of ~0.3 keV. Further improvement in the energy resolution and read noise is currently under progress. We have been working on the characterization of small pixel HCDs (12.5 micron pixel; smallest pixel HCDs developed so far) which is important for the development of next generation high resolution X-ray spectroscopic instrument based on HCDs. Event recognition in HCDs is another exciting prospect which have been successfully shown to work with a 64 X 64 pixel prototype SPEEDSTAR-EXD which use comparators at each pixel to read out only those pixels having detectable signal, thereby providing an order of magnitude improvement in the read out rate. Currently, we are working on the development of a large area SPEEDSTAR-EXD array for the development of a full fledged instrument. HCDs due to their fast read out, can also be explored as a large FOV instrument to study GRB afterglows and variability and spectroscopic study of other astrophysical transients. In this context, we are characterizing a Lobster-HCD system at multiple energies and multiple off-axis angles for future rocket or CubeSate experiments. In this presentation, I will briefly present these new developments and experiments with HCDs and the analysis techniques.

Rapid soft X-ray fluctuations in solar flares observed with the X-ray polychromator

NASA Technical Reports Server (NTRS)

Zarro, D. M.; Saba, J. L. R.; Strong, K. T.

1986-01-01

Three flares observed by the Soft X-Ray Polychromator on the Solar Maximum Mission were studied. Flare light curves from the Flat Crystal Spectrometer and Bent Crystal Spectrometer were examined for rapid signal variations. Each flare was characterized by an initial fast (less than 1 min) burst, observed by the Hard X-Ray Burst Spectrometer (HXRBS), followed by softer gradual X-ray emission lasting several minutes. From an autocorrelation function analysis, evidence was found for quasi-periodic fluctuations with rise and decay times of 10 s in the Ca XIX and Fe XXV light curves. These variations were of small amplitude (less than 20%), often coincided with hard X-ray emissions, and were prominent during the onset of the gradual phase after the initial hard X-ray burst. It is speculated that these fluctuations were caused by repeated energy injections in a coronal loop that had already been heated and filled with dense plasma associated with the initial hard X-ray burst.

Resonant soft X-ray scattering for polymer materials

DOE PAGES

Liu, Feng; Brady, Michael A.; Wang, Cheng

2016-04-16

Resonant Soft X-ray Scattering (RSoXS) was developed within the last few years, and the first dedicated resonant soft X-ray scattering beamline for soft materials was constructed at the Advanced Light Source, LBNL. RSoXS combines soft X-ray spectroscopy with X-ray scattering and thus offers statistical information for 3D chemical morphology over a large length scale range from nanometers to micrometers. Using RSoXS to characterize multi-length scale soft materials with heterogeneous chemical structures, we have demonstrated that soft X-ray scattering is a unique complementary technique to conventional hard X-ray and neutron scattering. Its unique chemical sensitivity, large accessible size scale, molecular bondmore » orientation sensitivity with polarized X-rays, and high coherence have shown great potential for chemically specific structural characterization for many classes of materials.« less

Characterization of CaMn2O4 By X-Ray Magnetic Linear Dichroism

NASA Astrophysics Data System (ADS)

Holroyd, Johnathon; Bhatkar, Harshawardhan; Arenholz, Elke; White, Ben; Neumeier, John; Idzerda, Yves

2008-05-01

Perovskite manganite such as LaxCa(1-x)MnO3 (LCMO) have recently drawn attention for their useful electronic and magnetic properties such as Colossal Magnetoresistance. It has been shown that under stress, LCMO thin films show changes in La and Ca concentrations near the interface. One potential impurity under La depleted conditions is antiferromagnetic CaMn2O4. In order to better understand the range of properties available within LCMO systems, it is important to be able to identify and characterize CaMn2O4 within LCMO thin films. X-ray absorption spectroscopy (XAS) and X-ray magnetic linear dichroism (XMLD) are well suited to this task due to their element specificity, sensitivity, and ability to characterize the measure the magnetic properties of antiferromagnetic systems. XAS and XMLD were measured on high quality single crystals of CaMn2O4. These spectra are distinguished from CaMnO3 and demonstrate antiferromagnetic structure.

Structural characterization of sol-gel derived oxide nanostuctures using synchrotron x-ray techniques

NASA Astrophysics Data System (ADS)

Sun, Tao

Ceramic oxides possess extraordinarily rich functionalities. With the advent of nanofabrication techniques, it is now possible to grow nanostructured oxides with precise control of composition, morphology, and microstructure, which has re-vitalized the research in the field of traditional ceramics. The unexpected behavior and enhanced properties of oxide nanostructures have been extensively reported. However, knowledge about the underlying mechanisms as well as structural implications is still quite limited. Therefore, it is imperative to develop and employ sophisticated characterization tools for unraveling the structure-property relationships for oxide nanostructures. The present thesis work aims at addressing the critical issues associated with fabrication, and more importantly, structural characterization of functional oxide nanostructures. The dissertation starts with introducing the strategy for synthesizing phase-pure and highly controlled oxide nanostructures using sol-gel deposition and an innovative approach called "soft" electron beam lithography. Some specific oxides are chosen for the present study, such as BiFeO3, CoFe2O4, and SnO2, because of their scientific and technological significance. Subsequent to fabrication of tailored oxide nanostructures, advanced synchrotron x-ray scattering techniques have been applied for structural characterization. The nucleation and growth behavior of BiFeO3 thin film was investigated using in situ grazing-incidence small-angle x-ray scattering (GISAXS) technique. The results reveal that the kinetics for early-stage nuclei growth are governed by the oriented-attachment model. Moreover, the porous structures of undoped and Pd-doped semiconducting SnOx thin films were quantitatively characterized using GISAXS. By correlating the structural parameters with H2 sensitivity of SnOx films, it is found out that the microstructure of doped film is favorable for gas sensing, but it is not the major reason for the overall

Off-plane x-ray reflection grating fabrication

NASA Astrophysics Data System (ADS)

Peterson, Thomas J.; DeRoo, Casey T.; Marlowe, Hannah; McEntaffer, Randall L.; Miles, Drew M.; Tutt, James H.; Schultz, Ted B.

2015-09-01

Off-plane X-ray diffraction gratings with precision groove profiles at the submicron scale will be used in next generation X-ray spectrometers. Such gratings will be used on a current NASA suborbital rocket mission, the Off-plane Grating Rocket Experiment (OGRE), and have application for future grating missions. The fabrication of these gratings does not come without challenges. High performance off-plane gratings must be fabricated with precise radial grating patterns, optically at surfaces, and specific facet angles. Such gratings can be made using a series of common micro-fabrication techniques. The resulting process is highly customizable, making it useful for a variety of different mission architectures. In this paper, we detail the fabrication method used to produce high performance off-plane gratings and report the results of a preliminary qualification test of a grating fabricated in this manner. The grating was tested in the off-plane `Littrow' configuration, for which the grating is most efficient for a given diffraction order, and found to achieve 42% relative efficiency in the blaze order with respect to all diffracted light.

Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity.

PubMed

Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Theis-Bröhl, K; Devishvili, A; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C; Toperverg, B P; Zabel, H

2012-02-10

We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole-dipole interaction is rather strong, dominating the collective magnetic properties at room temperature.

Imaging Schwarzschild multilayer X-ray microscope

NASA Technical Reports Server (NTRS)

Hoover, Richard B.; Baker, Phillip C.; Shealy, David L.; Core, David B.; Walker, Arthur B. C., Jr.; Barbee, Troy W., Jr.; Kerstetter, Ted

1993-01-01

We have designed, analyzed, fabricated, and tested Schwarzschild multilayer X-ray microscopes. These instruments use flow-polished Zerodur mirror substrates which have been coated with multilayers optimized for maximum reflectivity at normal incidence at 135 A. They are being developed as prototypes for the Water Window Imaging X-Ray Microscope. Ultrasmooth mirror sets of hemlite grade sapphire have been fabricated and they are now being coated with multilayers to reflect soft X-rays at 38 A, within the biologically important 'water window'. In this paper, we discuss the fabrication of the microscope optics and structural components as well as the mounting of the optics and assembly of the microscopes. We also describe the optical alignment, interferometric and visible light testing of the microscopes, present interferometrically measured performance data, and provide the first results of optical imaging tests.

Cosmic X-ray physics

NASA Technical Reports Server (NTRS)

Mccammon, D.; Cox, D. P.; Kraushaar, W. L.; Sanders, W. T.

1986-01-01

The analysis of the beryllium-filtered data from Flight 17.020 was completed. The data base provided by the Wisconsin diffuse X-ray sky survey is being analyzed by correlating the B and C band emission with individual velocity components of neutral hydrogen. Work on a solid state detector to be used in high resolution spectroscopy of diffuse or extend X-ray sources is continuing. A series of 21 cm observations was completed. A paper on the effects of process parameter variation on the reflectivity of sputter-deposited tungsten-carvon multilayers was published.

Projection x-ray topography system at 1-BM x-ray optics test beamline at the advanced photon source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Stoupin, Stanislav, E-mail: sstoupin@aps.anl.gov; Liu, Zunping; Trakhtenberg, Emil

2016-07-27

Projection X-ray topography of single crystals is a classic technique for the evaluation of intrinsic crystal quality of large crystals. In this technique a crystal sample and an area detector (e.g., X-ray film) collecting intensity of a chosen crystallographic reflection are translated simultaneously across an X-ray beam collimated in the diffraction scattering plane (e.g., [1, 2]). A bending magnet beamline of a third-generation synchrotron source delivering x-ray beam with a large horizontal divergence, and therefore, a large horizontal beam size at a crystal sample position offers an opportunity to obtain X-ray topographs of large crystalline samples (e.g., 6-inch wafers) inmore » just a few exposures. Here we report projection X-ray topography system implemented recently at 1-BM beamline of the Advanced Photon Source. A selected X-ray topograph of a 6-inch wafer of 4H-SiC illustrates capabilities and limitations of the technique.« less

A detailed X-ray investigation of ζ Puppis. IV. Further characterization of the variability

NASA Astrophysics Data System (ADS)

Nazé, Yaël; Ramiaramanantsoa, Tahina; Stevens, Ian R.; Howarth, Ian D.; Moffat, Anthony F. J.

2018-01-01

Context. One of the optically brightest and closest massive stars, ζ Pup, is also a bright X-ray source. Previously, its X-ray emission was found to be variable with light curves harbouring "trends" with a typical timescale longer than the exposure length, i.e. >1 d. The origin of these changes was proposed to be linked to large-scale structures in the wind of ζ Pup, but further characterization of the variability at high energies was needed to investigate this scenario. Aims: Since the previous papers of this series, a number of new X-ray observations have become available. Furthermore, a cyclic behaviour with a 1.78 d period was identified in long optical photometric runs, which is thought to be associated with the launching mechanism of large-scale wind structures. Methods: We analysed these new X-ray data, revisited the old data, and compared the X-ray light curves with the optical data, notably those taken simultaneously. Results: The behaviour of ζ Pup in X-rays cannot be explained in terms of a perfect clock because the amplitude and shape of its variations change with time. For example, ζ Pup was much more strongly variable between 2007 and 2011 than before and after this interval. Comparing the X-ray spectra of the star at maximum and minimum brightness yields no compelling difference beyond the overall flux change: the temperatures, absorptions, and line shapes seem to remain constant, well within errors. The only common feature between X-ray datasets is that the variation amplitudes appear maximum in the medium (0.6-1.2 keV) energy band. Finally, no clear and coherent correlation can be found between simultaneous X-ray and optical data. Only a subgroup of observations may be combined coherently with the optical period of 1.78 d, although the simultaneous optical behaviour is unknown. Conclusions: The currently available data do not reveal any obvious, permanent, and direct correlation between X-ray and optical variations. The origin of the X-ray

Characterizing X-ray Attenuation of Containerized Cargo

DOE Office of Scientific and Technical Information (OSTI.GOV)

Birrer, N.; Divin, C.; Glenn, S.

X-ray inspection systems can be used to detect radiological and nuclear threats in imported cargo. In order to better understand performance of these systems, the attenuation characteristics of imported cargo need to be determined. This project focused on developing image processing algorithms for segmenting cargo and using x-ray attenuation to quantify equivalent steel thickness to determine cargo density. These algorithms were applied to over 450 cargo radiographs. The results are summarized in this report.

NuSTAR SPECTROSCOPY OF MULTI-COMPONENT X-RAY REFLECTION FROM NGC 1068

DOE Office of Scientific and Technical Information (OSTI.GOV)

Bauer, Franz E.; Arévalo, Patricia; Walton, Dominic J.

2015-10-20

We report on high-energy X-ray observations of the Compton-thick Seyfert 2 galaxy NGC 1068 with NuSTAR, which provide the best constraints to date on its >10 keV spectral shape. The NuSTAR data are consistent with those from past and current instruments to within cross-calibration uncertainties, and we find no strong continuum or line variability over the past two decades, which is in line with its X-ray classification as a reflection-dominated Compton-thick active galactic nucleus. The combined NuSTAR, Chandra, XMM-Newton, and Swift BAT spectral data set offers new insights into the complex secondary emission seen instead of the completely obscured transmittedmore » nuclear continuum. The critical combination of the high signal-to-noise NuSTAR data and the decomposition of the nuclear and extranuclear emission with Chandra allow us to break several model degeneracies and greatly aid physical interpretation. When modeled as a monolithic (i.e., a single N{sub H}) reflector, none of the common Compton reflection models are able to match the neutral fluorescence lines and broad spectral shape of the Compton reflection hump without requiring unrealistic physical parameters (e.g., large Fe overabundances, inconsistent viewing angles, or poor fits to the spatially resolved spectra). A multi-component reflector with three distinct column densities (e.g., with best-fit values of N{sub H} of 1.4 × 10{sup 23}, 5.0 × 10{sup 24}, and 10{sup 25} cm{sup −2}) provides a more reasonable fit to the spectral lines and Compton hump, with near-solar Fe abundances. In this model, the higher N{sub H} component provides the bulk of the flux to the Compton hump, while the lower N{sub H} component produces much of the line emission, effectively decoupling two key features of Compton reflection. We find that ≈30% of the neutral Fe Kα line flux arises from >2″ (≈140 pc) and is clearly extended, implying that a significant fraction (and perhaps most) of the <10 keV reflected

The reflection spectrum of the low-mass X-ray binary 4U 1636-53

NASA Astrophysics Data System (ADS)

Wang, Yanan; Méndez, Mariano; Sanna, Andrea; Altamirano, Diego; Belloni, T. M.

2017-06-01

We present 3-79 keV NuSTAR observations of the neutron star low-mass X-ray binary 4U 1636-53 in the soft, transitional and hard state. The spectra display a broad emission line at 5-10 keV. We applied several models to fit this line: A Gaussian line, a relativistically broadened emission line model, kyrline, and two models including relativistically smeared and ionized reflection off the accretion disc with different coronal heights, relxill and relxilllp. All models fit the spectra well; however, the kyrline and relxill models yield an inclination of the accretion disc of ˜88° with respect to the line of sight, which is at odds with the fact that this source shows no dips or eclipses. The relxilllp model, on the other hand, gives a reasonable inclination of ˜56°. We discuss our results for these models in this source and the possible primary source of the hard X-rays.

Design of a normal incidence multilayer imaging x-ray microscope.

PubMed

Shealy, D L; Gabardi, D R; Hoover, R B; Walker, A B; Lindblom, J F; Barbee, T W

1989-01-01

Normal incidence multilayer Cassegrain x-ray telescopes were flown on the Stanford/MSFC Rocket X-Ray Spectroheliograph. These instruments produced high spatial resolution images of the Sun and conclusively demonstrated that doubly reflecting multilayer x-ray optical systems are feasible. The images indicated that aplanatic imaging soft x-ray /EUV microscopes should be achievable using multilayer optics technology. We have designed a doubly reflecting normal incidence multilayer imaging x-ray microscope based on the Schwarzschild configuration. The Schwarzschild microscope utilizes two spherical mirrors with concentric radii of curvature which are chosen such that the third-order spherical aberration and coma are minimized. We discuss the design of the microscope and the results of the optical system ray trace analysis which indicates that diffraction-limited performance with 600 Å spatial resolution should be obtainable over a 1 mm field of view at a wavelength of 100 Å. Fabrication of several imaging soft x-ray microscopes based upon these designs, for use in conjunction with x-ray telescopes and laser fusion research, is now in progress. High resolution aplanatic imaging x-ray microscopes using normal incidence multilayer x-ray mirrors should have many important applications in advanced x-ray astronomical instrumentation, x-ray lithography, biological, biomedical, metallurgical, and laser fusion research.

New x-ray parallel beam facility XPBF 2.0 for the characterization of silicon pore optics

NASA Astrophysics Data System (ADS)

Krumrey, Michael; Müller, Peter; Cibik, Levent; Collon, Max; Barrière, Nicolas; Vacanti, Giuseppe; Bavdaz, Marcos; Wille, Eric

2016-07-01

A new X-ray parallel beam facility (XPBF 2.0) has been installed in the laboratory of the Physikalisch-Technische Bundesanstalt at the synchrotron radiation facility BESSY II in Berlin to characterize silicon pore optics (SPOs) for the future X-ray observatory ATHENA. As the existing XPBF which is operated since 2005, the new beamline provides a pencil beam of very low divergence, a vacuum chamber with a hexapod system for accurate positioning of the SPO to be investigated, and a vertically movable CCD-based camera system to register the direct and the reflected beam. In contrast to the existing beamline, a multilayer-coated toroidal mirror is used for beam monochromatization at 1.6 keV and collimation, enabling the use of beam sizes between about 100 μm and at least 5 mm. Thus the quality of individual pores as well as the focusing properties of large groups of pores can be investigated. The new beamline also features increased travel ranges for the hexapod to cope with larger SPOs and a sample to detector distance of 12 m corresponding to the envisaged focal length of ATHENA.

Lacquer polishing of X-ray optics

NASA Technical Reports Server (NTRS)

Catura, R. C.; Joki, E. G.; Roethig, D. T.; Brookover, W. J.

1987-01-01

Techniques for polishing figured X-ray optics by a lacquer-coating process are described. This acrylic lacquer coating has been applied with an optical quality of an eighth-wave in red light and very effectively covers surface roughness with spatial wavelengths less than about 0.2 mm. Tungsten films have been deposited on the lacquer coatings to provide highly efficient X-ray reflectivity.

Crystals for astronomical X-ray spectroscopy

NASA Technical Reports Server (NTRS)

Burek, A.

1976-01-01

Crystal spectrometric properties and the factors that affect their measurement are discussed. Theoretical and experimental results on KAP are summarized and theoretical results based on the dynamical theory of X-ray diffraction are given for the acid phthalates as well as for the commonly used planes of ADP, PET and EDDT. Anomalous dispersion is found to be important for understanding the details of crystal Bragg reflection properties at long X-ray wavelengths and some important effects are pointed out. The theory of anomalous dispersion is applied to explain the anomalous reflectivity exhibited by KAP at 23.3 A.

X-ray photonic microsystems for the manipulation of synchrotron light

DOE PAGES

Mukhopadhyay, D.; Walko, D. A.; Jung, I. W.; ...

2015-05-05

In this study, photonic microsystems played an essential role in the development of integrated photonic devices, thanks to their unique spatiotemporal control and spectral shaping capabilities. Similar capabilities to markedly control and manipulate X-ray radiation are highly desirable but practically impossible due to the massive size of the silicon single-crystal optics currently used. Here we show that micromechanical systems can be used as X-ray optics to create and preserve the spatial, temporal and spectral correlation of the X-rays. We demonstrate that, as X-ray reflective optics they can maintain the wavefront properties with nearly 100% reflectivity, and as a dynamic diffractivemore » optics they can generate nanosecond time windows with over 100-kHz repetition rates. Since X-ray photonic microsystems can be easily incorporated into lab-based and next-generation synchrotron X-ray sources, they bring unprecedented design flexibility for future dynamic and miniature X-ray optics for focusing, wavefront manipulation, multicolour dispersion, and pulse slicing.« less

Generation of first hard X-ray pulse at Tsinghua Thomson Scattering X-ray Source.

PubMed

Du, Yingchao; Yan, Lixin; Hua, Jianfei; Du, Qiang; Zhang, Zhen; Li, Renkai; Qian, Houjun; Huang, Wenhui; Chen, Huaibi; Tang, Chuanxiang

2013-05-01

Tsinghua Thomson Scattering X-ray Source (TTX) is the first-of-its-kind dedicated hard X-ray source in China based on the Thomson scattering between a terawatt ultrashort laser and relativistic electron beams. In this paper, we report the experimental generation and characterization of the first hard X-ray pulses (51.7 keV) via head-on collision of an 800 nm laser and 46.7 MeV electron beams. The measured yield is 1.0 × 10(6) per pulse with an electron bunch charge of 200 pC and laser pulse energy of 300 mJ. The angular intensity distribution and energy spectra of the X-ray pulse are measured with an electron-multiplying charge-coupled device using a CsI scintillator and silicon attenuators. These measurements agree well with theoretical and simulation predictions. An imaging test using the X-ray pulse at the TTX is also presented.

Novel wide-field x-ray optics for space

NASA Astrophysics Data System (ADS)

Hudec, René; Pína, Ladislav; Inneman, Adolf

2017-11-01

We report on the program of design and development of innovative very wide field X-ray optics for space applications. We describe the idea of wide field X-ray optics of the lobster-eye type of both Angel and Schmidt arrangements. This optics was suggested in 70ies but not yet used in space experiment due to severe manufacturing problems. The lobster-eye X-ray optics may achieve up to 180 degrees (diameter) field of view at angular resolution of order of 1 arcmin. We report on various prototypes of lobster-eye X-ray lenses based on alternative technologies (replicated double sided X-ray reflecting flats, float glass, replicated square channels etc.) as well as on their optical and X-ray tests. We also discuss the importance and performance of lobster-eye X-ray telescopes in future X-ray astronomy projects.

Prototyping iridium coated mirrors for x-ray astronomy

NASA Astrophysics Data System (ADS)

Döhring, Thorsten; Probst, Anne-Catherine; Stollenwerk, Manfred; Emmerich, Florian; Stehlíková, Veronika; Inneman, Adolf

2017-05-01

X-ray astronomy uses space-based telescopes to overcome the disturbing absorption of the Earth's atmosphere. The telescope mirrors are operating at grazing incidence angles and are coated with thin metal films of high-Z materials to get sufficient reflectivity for the high-energy radiation to be observed. In addition the optical payload needs to be light-weighted for launcher mass constrains. Within the project JEUMICO, an acronym for "Joint European Mirror Competence", the Aschaffenburg University of Applied Sciences and the Czech Technical University in Prague started a collaboration to develop mirrors for X-ray telescopes. The X-ray telescopes currently developed within this Bavarian- Czech project are of Lobster eye type optical design. Corresponding mirror segments use substrates of flat silicon wafers which are coated with thin iridium films, as this material is promising high reflectivity in the X-ray range of interest. The deposition of the iridium films is based on a magnetron sputtering process. Sputtering with different parameters, especially by variation of the argon gas pressure, leads to iridium films with different properties. In addition to investigations of the uncoated mirror substrates the achieved surface roughness has been studied. Occasional delamination of the iridium films due to high stress levels is prevented by chromium sublayers. Thereby the sputtering parameters are optimized in the context of the expected reflectivity of the coated X-ray mirrors. In near future measurements of the assembled mirror modules optical performances are planned at an X-ray test facility.

Background-reducing X-ray multilayer mirror

DOEpatents

Bloch, Jeffrey J.; Roussel-Dupre', Diane; Smith, Barham W.

1992-01-01

Background-reducing x-ray multilayer mirror. A multiple-layer "wavetrap" deposited over the surface of a layered, synthetic-microstructure soft x-ray mirror optimized for reflectivity at chosen wavelengths is disclosed for reducing the reflectivity of undesired, longer wavelength incident radiation incident thereon. In three separate mirror designs employing an alternating molybdenum and silicon layered, mirrored structure overlaid by two layers of a molybdenum/silicon pair anti-reflection coating, reflectivities of near normal incidence 133, 171, and 186 .ANG. wavelengths have been optimized, while that at 304 .ANG. has been minimized. The optimization process involves the choice of materials, the composition of the layer/pairs as well as the number thereof, and the distance therebetween for the mirror, and the simultaneous choice of materials, the composition of the layer/pairs, and their number and distance for the "wavetrap."

Total reflection X-ray Fluorescence determination of interfering elements rubidium and uranium by profile fitting

NASA Astrophysics Data System (ADS)

Dhara, Sangita; Khooha, Ajay; Singh, Ajit Kumar; Tiwari, M. K.; Misra, N. L.

2018-06-01

Systematic studies to assess the analytical parameters obtained in the total reflection X-ray fluorescence (TXRF) determinations of interfering elements Rb and U using profile fitting are reported in the present manuscript. The X-ray lines Rb Kα and U Lα having serious spectral interference (ΔE = 218 eV), have been used as analytical lines. The intensities of these X-ray lines have been assessed using profile fitting. In order to compare the analytical results of Rb determinations in presence of U, with and without U excitation, synchrotron radiation was tuned to energy just above and below the U Labs edge. This approach shall excite both Rb Kα and U Lα simultaneously and Rb Kα selectively. Finally, the samples were also analyzed with a laboratory based TXRF spectrometer. The analytical results obtained in all these conditions were comparable. The authenticity of the results was assessed by analyzing U with respect to Rb in Rb2U(SO4)3, a standard reference material for U. The average precision obtained for TXRF determinations was below 3% (RSD, n = 3, 1σ) and the percent deviation of TXRF values from the expected values calculated on the basis of sample preparation was within 3%.

Simulation of X-ray transient absorption for following vibrations in coherently ionized F2 molecules

NASA Astrophysics Data System (ADS)

Dutoi, Anthony D.; Leone, Stephen R.

2017-01-01

Femtosecond and attosecond X-ray transient absorption experiments are becoming increasingly sophisticated tools for probing nuclear dynamics. In this work, we explore and develop theoretical tools needed for interpretation of such spectra,in order to characterize the vibrational coherences that result from ionizing a molecule in a strong IR field. Ab initio data for F2 is combined with simulations of nuclear dynamics, in order to simulate time-resolved X-ray absorption spectra for vibrational wavepackets after coherent ionization at 0 K and at finite temperature. Dihalogens pose rather difficult electronic structure problems, and the issues encountered in this work will be reflective of those encountered with any core-valence excitation simulation when a bond is breaking. The simulations reveal a strong dependence of the X-ray absorption maximum on the locations of the vibrational wave packets. A Fourier transform of the simulated signal shows features at the overtone frequencies of both the neutral and the cation, which reflect spatial interferences of the vibrational eigenstates. This provides a direct path for implementing ultrafast X-ray spectroscopic methods to visualize coherent nuclear dynamics.

Refractive optics to compensate x-ray mirror shape-errors

NASA Astrophysics Data System (ADS)

Laundy, David; Sawhney, Kawal; Dhamgaye, Vishal; Pape, Ian

2017-08-01

Elliptically profiled mirrors operating at glancing angle are frequently used at X-ray synchrotron sources to focus X-rays into sub-micrometer sized spots. Mirror figure error, defined as the height difference function between the actual mirror surface and the ideal elliptical profile, causes a perturbation of the X-ray wavefront for X- rays reflecting from the mirror. This perturbation, when propagated to the focal plane results in an increase in the size of the focused beam. At Diamond Light Source we are developing refractive optics that can be used to locally cancel out the wavefront distortion caused by figure error from nano-focusing elliptical mirrors. These optics could be used to correct existing optical components on synchrotron radiation beamlines in order to give focused X-ray beam sizes approaching the theoretical diffraction limit. We present our latest results showing measurement of the X-ray wavefront error after reflection from X-ray mirrors and the translation of the measured wavefront into a design for refractive optical elements for correction of the X-ray wavefront. We show measurement of the focused beam with and without the corrective optics inserted showing reduction in the size of the focus resulting from the correction to the wavefront.

Impulsive solar X-ray bursts. III - Polarization, directivity, and spectrum of the reflected and total bremsstrahlung radiation from a beam of electrons directed toward the photosphere

NASA Technical Reports Server (NTRS)

Langer, S. H.; Petrosian, V.

1977-01-01

The paper presents the spectrum, directivity, and state of polarization of the bremsstrahlung radiation expected from a beam of high-energy electrons spiraling along radial magnetic field lines toward the photosphere. A Monte Carlo method is then described for evaluation of the spectrum, directivity, and polarization of X-rays diffusely reflected from stellar photospheres. The accuracy of the technique is evaluated through comparison with analytic results. The calculated characteristics of the incident X-rays are used to evaluate the spectrum, directivity, and polarization of the reflected and total X-ray fluxes. The results are compared with observations.

Femtosecond profiling of shaped x-ray pulses

NASA Astrophysics Data System (ADS)

Hoffmann, M. C.; Grguraš, I.; Behrens, C.; Bostedt, C.; Bozek, J.; Bromberger, H.; Coffee, R.; Costello, J. T.; DiMauro, L. F.; Ding, Y.; Doumy, G.; Helml, W.; Ilchen, M.; Kienberger, R.; Lee, S.; Maier, A. R.; Mazza, T.; Meyer, M.; Messerschmidt, M.; Schorb, S.; Schweinberger, W.; Zhang, K.; Cavalieri, A. L.

2018-03-01

Arbitrary manipulation of the temporal and spectral properties of x-ray pulses at free-electron lasers would revolutionize many experimental applications. At the Linac Coherent Light Source at Stanford National Accelerator Laboratory, the momentum phase-space of the free-electron laser driving electron bunch can be tuned to emit a pair of x-ray pulses with independently variable photon energy and femtosecond delay. However, while accelerator parameters can easily be adjusted to tune the electron bunch phase-space, the final impact of these actuators on the x-ray pulse cannot be predicted with sufficient precision. Furthermore, shot-to-shot instabilities that distort the pulse shape unpredictably cannot be fully suppressed. Therefore, the ability to directly characterize the x-rays is essential to ensure precise and consistent control. In this work, we have generated x-ray pulse pairs via electron bunch shaping and characterized them on a single-shot basis with femtosecond resolution through time-resolved photoelectron streaking spectroscopy. This achievement completes an important step toward future x-ray pulse shaping techniques.

Femtosecond profiling of shaped x-ray pulses

DOE Office of Scientific and Technical Information (OSTI.GOV)

Hoffmann, M. C.; Grguras, I.; Behrens, C.

Arbitrary manipulation of the temporal and spectral properties of x-ray pulses at free-electron lasers would revolutionize many experimental applications. At the Linac Coherent Light Source at Stanford National Accelerator Laboratory, the momentum phase-space of the free-electron laser driving electron bunch can be tuned to emit a pair of x-ray pulses with independently variable photon energy and femtosecond delay. However, while accelerator parameters can easily be adjusted to tune the electron bunch phase-space, the final impact of these actuators on the x-ray pulse cannot be predicted with sufficient precision. Furthermore, shot-to-shot instabilities that distort the pulse shape unpredictably cannot be fullymore » suppressed. Therefore, the ability to directly characterize the x-rays is essential to ensure precise and consistent control. In this work, we have generated x-ray pulse pairs via electron bunch shaping and characterized them on a single-shot basis with femtosecond resolution through time-resolved photoelectron streaking spectroscopy. Furthermore, this achievement completes an important step toward future x-ray pulse shaping techniques.« less

Femtosecond profiling of shaped x-ray pulses

DOE PAGES

Hoffmann, M. C.; Grguras, I.; Behrens, C.; ...

2018-03-26

Arbitrary manipulation of the temporal and spectral properties of x-ray pulses at free-electron lasers would revolutionize many experimental applications. At the Linac Coherent Light Source at Stanford National Accelerator Laboratory, the momentum phase-space of the free-electron laser driving electron bunch can be tuned to emit a pair of x-ray pulses with independently variable photon energy and femtosecond delay. However, while accelerator parameters can easily be adjusted to tune the electron bunch phase-space, the final impact of these actuators on the x-ray pulse cannot be predicted with sufficient precision. Furthermore, shot-to-shot instabilities that distort the pulse shape unpredictably cannot be fullymore » suppressed. Therefore, the ability to directly characterize the x-rays is essential to ensure precise and consistent control. In this work, we have generated x-ray pulse pairs via electron bunch shaping and characterized them on a single-shot basis with femtosecond resolution through time-resolved photoelectron streaking spectroscopy. Furthermore, this achievement completes an important step toward future x-ray pulse shaping techniques.« less

Preparation, characterization and X-ray attenuation property of Gd2O3-based nanocomposites

NASA Astrophysics Data System (ADS)

Jayakumar, Sangeetha; Saravanan, T.; Philip, John

2017-11-01

In an attempt to develop an alternate to lead-based X-ray shielding material, we describe the X-ray attenuation property of nanocomposites containing Gd2O3 as nanofiller and silicone resin as matrix, prepared by a simple solution-casting technique. Gd2O3 nanoparticles of size 30 and 56 nm are used at concentrations of 25 and 2.5 wt%. The nanoparticles and the nanocomposites are characterized using X-ray diffraction (XRD) studies, small angle X-ray spectroscopy (SAXS), thermogravimetric analysis (TGA), differential scanning calorimetry (DSC) and atomic force microscopy (AFM). The X-ray attenuation property of nanocomposites, studied using an industrial X-ray unit, shows that nanocomposites containing nanoparticles of size 56 nm (G2) exhibit better attenuation than nanocomposites containing nanoparticles of size 30 nm (G1), which is attributed to the greater interfacial interaction between the G2 nanofillers and silicone matrix. In the case of nanocomposites containing G1 nanoparticles, the interfacial interaction between the nanofiller and the matrix is so weak that it results in pulling out of nanofillers, causing voids in the matrix, which act as X-ray transparent region, thereby reducing the overall X-ray attenuation property of G1 nanocomposites. This is further corroborated from the AFM images of the nanocomposites. The weight loss and heat flow curves of pure silicone matrix and the nanocomposites containing Gd2O3 nanoparticles of size 30 and 56 nm show the degradation of silicone resin, due to chain scission, between 403 and 622 °C. The same onset temperature (403 °C) of degradation of matrix with and without nanoparticles shows that the addition of nanofillers to the matrix does not deteriorate the thermal stability of the matrix. This confirms the thermal stability of nanocomposites. Therefore, our study shows that nanocomposites containing G2 nanoparticles are potential candidates for the development of X-ray opaque fabric material.

Characterization of uranium bearing material using x-ray fluorescence and direct gamma-rays measurement techniques

DOE Office of Scientific and Technical Information (OSTI.GOV)

Mujaini, M., E-mail: madihah@uniten.edu.my; Chankow, N.; Yusoff, M. Z.

2016-01-22

Uranium ore can be easily detected due to various gamma-ray energies emitted from uranium daughters particularly from {sup 238}U daughters such as {sup 214}Bi, {sup 214}Pb and {sup 226}Ra. After uranium is extracted from uranium ore, only low energy gamma-rays emitted from {sup 235}U may be detected if the detector is placed in close contact to the specimen. In this research, identification and characterization of uranium bearing materials is experimentally investigated using direct measurement of gamma-rays from {sup 235}U in combination with the x-ray fluorescence (XRF) technique. Measurement of gamma-rays can be conducted by using high purity germanium (HPGe) detectormore » or cadmium telluride (CdTe) detector while a {sup 57}Coradioisotope-excited XRF spectrometer using CdTe detector is used for elemental analysis. The proposed technique was tested with various uranium bearing specimens containing natural, depleted and enriched uranium in both metallic and powder forms.« less

A first evaluation of the analytical capabilities of the new X-ray fluorescence facility at International Atomic Energy Agency-Elettra Sincrotrone Trieste for multipurpose total reflection X-ray fluorescence analysis

NASA Astrophysics Data System (ADS)

Marguí, Eva; Hidalgo, Manuela; Migliori, Alessandro; Leani, Juan José; Queralt, Ignasi; Kallithrakas-Kontos, Nikolaos; Streli, Christina; Prost, Josef; Karydas, Andreas Germanos

2018-07-01

The aim of the work is to present a systematic evaluation of the analytical capabilities of the new X-ray fluorescence facility jointly operated between the International Atomic Energy Agency and the Elettra Sincrotrone Trieste for multipurpose total reflection X-ray fluorescence analysis. The analytical performance of the XRF beamline end-station (IAEAXspe) was systematically evaluated under TXRF excitation geometry by analyzing different types of aqueous (lake, waste and fresh water) and solid (soil, vegetal, biological) certified reference materials using an excitation energy of 13.0 keV (for the purpose of multielemental analysis). The results obtained for both types of samples in terms of limits of detection and accuracy were also compared with those obtained using laboratory X-ray tube based TXRF systems with different features (including Mo and W X-ray tube systems). Taking advantage of the possibility to work under high vacuum, the IAEAXspe set-up instrumental sensitivity was also determined using an excitation energy of 6.2 keV to explore the possibilities for light elements determination. A clear improvement of the element detection limits is achieved when comparing this facility to conventional X-ray tube based TXRF systems highlighting the benefits of using the monoenergetic synchrotron exciting radiation and the ultra-high vacuum chamber in comparison with conventional laboratory systems. The results of the present work are discussed in view of further exploitation of the facility for different environmental and biological related applications.

Optical and x-ray characterization of two novel CMOS image sensors

NASA Astrophysics Data System (ADS)

Bohndiek, Sarah E.; Arvanitis, Costas D.; Venanzi, Cristian; Royle, Gary J.; Clark, Andy T.; Crooks, Jamie P.; Prydderch, Mark L.; Turchetta, Renato; Blue, Andrew; Speller, Robert D.

2007-02-01

A UK consortium (MI3) has been founded to develop advanced CMOS pixel designs for scientific applications. Vanilla, a 520x520 array of 25μm pixels benefits from flushed reset circuitry for low noise and random pixel access for region of interest (ROI) readout. OPIC, a 64x72 test structure array of 30μm digital pixels has thresholding capabilities for sparse readout at 3,700fps. Characterization is performed with both optical illumination and x-ray exposure via a scintillator. Vanilla exhibits 34+/-3e - read noise, interactive quantum efficiency of 54% at 500nm and can read a 6x6 ROI at 24,395fps. OPIC has 46+/-3e - read noise and a wide dynamic range of 65dB due to high full well capacity. Based on these characterization studies, Vanilla could be utilized in applications where demands include high spectral response and high speed region of interest readout while OPIC could be used for high speed, high dynamic range imaging.

X-Ray Absorbed, Broad-Lined, Red AGN and the Cosmic X-Ray Background

NASA Technical Reports Server (NTRS)

Mushotzky, Richard (Technical Monitor); Wilkes, Belinda

2005-01-01

We have obtained XMM spectra for five red, 2MASS AGN, selected from a sample observed by Chandra to be X-ray bright and to cover a range of hardness ratios. Our results confirm the presence of substantial absorbing material in three sources which have optical classifications ranging from Type 1 to Type 2, with an intrinsically flat (hard) power law continuum indicated in the other two. The presence of both X-ray absorption and broad optical emission lines with the usual strength suggests either a small (nuclear) absorber or a favored viewing angle so as to cover the X-ray source but not the broad emission line region (BELR). A soft excess is detected in all three Type 1 sources. We speculate that this soft X-ray emission may arise in an extended region of ionized gas, perhaps linked with the polarized (scattered) light which is a feature of these sources. The spectral complexity revealed by XMM emphasizes the limitations of the low S/N Chandra data. Overall, the new XMM results strengthen our conclusions (Wilkes et al. 2002) that the observed X-ray continua of red AGN are unusually hard at energies greater than 2 keV. Whether due to substantial line-of-sight absorption or to an intrinsically hard or reflection-dominated spectrum, these 'red' AGN have an observed spectral form consistent with contributing significantly to the missing had absorbed population of the Cosmic X-ray Background (CXRB). When absorption and or reflection is taken into account, all these AGN have power law slopes typical of broad-line (Type 1) AGN (Gamma approximately 1.9). This appears to resolve the spectral paradox which for so long has existed between the CXRB and the AGN thought to be the dominant contributors. It also suggests two scenarios whereby Type 1 AGN/QSOs may be responsible for a significant fraction of the CXRB at energies above 2 keV: 1) X-ray absorbed AGN/QSOs with visible broad emission lines; 2) AGN/QSOs with complex spectra whose hardness greater than 2 keV is not

Detection of Reflection Features in the Neutron Star Low-mass X-Ray Binary Serpens X-1 with NICER

NASA Astrophysics Data System (ADS)

Ludlam, R. M.; Miller, J. M.; Arzoumanian, Z.; Bult, P. M.; Cackett, E. M.; Chakrabarty, D.; Dauser, T.; Enoto, T.; Fabian, A. C.; García, J. A.; Gendreau, K. C.; Guillot, S.; Homan, J.; Jaisawal, G. K.; Keek, L.; La Marr, B.; Malacaria, C.; Markwardt, C. B.; Steiner, J. F.; Strohmayer, T. E.

2018-05-01

We present Neutron Star Interior Composition Explorer (NICER) observations of the neutron star (NS) low-mass X-ray binary Serpens X-1 during the early mission phase in 2017. With the high spectral sensitivity and low-energy X-ray passband of NICER, we are able to detect the Fe L line complex in addition to the signature broad, asymmetric Fe K line. We confirm the presence of these lines by comparing the NICER data to archival observations with XMM-Newton/Reflection Grating Spectrometer (RGS) and NuSTAR. Both features originate close to the innermost stable circular orbit (ISCO). When modeling the lines with the relativistic line model RELLINE, we find that the Fe L blend requires an inner disk radius of {1.4}-0.1+0.2 R ISCO and Fe K is at {1.03}-0.03+0.13 R ISCO (errors quoted at 90%). This corresponds to a position of {17.3}-1.2+2.5 km and {12.7}-0.4+1.6 km for a canonical NS mass ({M}NS}=1.4 {M}ȯ ) and dimensionless spin value of a = 0. Additionally, we employ a new version of the RELXILL model tailored for NSs and determine that these features arise from a dense disk and supersolar Fe abundance.

Soft x-ray reduction camera for submicron lithography

DOEpatents

Hawryluk, Andrew M.; Seppala, Lynn G.

1991-01-01

Soft x-ray projection lithography can be performed using x-ray optical components and spherical imaging lenses (mirrors), which form an x-ray reduction camera. The x-ray reduction is capable of projecting a 5x demagnified image of a mask onto a resist coated wafer using 4.5 nm radiation. The diffraction limited resolution of this design is about 135 nm with a depth of field of about 2.8 microns and a field of view of 0.2 cm.sup.2. X-ray reflecting masks (patterned x-ray multilayer mirrors) which are fabricated on thick substrates and can be made relatively distortion free are used, with a laser produced plasma for the source. Higher resolution and/or larger areas are possible by varying the optic figures of the components and source characteristics.

Monitoring X-Ray Emission from X-Ray Bursters

NASA Technical Reports Server (NTRS)

Halpern, Jules P.; Kaaret, Philip

1999-01-01

The scientific goal of this project was to monitor a selected sample of x-ray bursters using data from the All-Sky Monitor (ASM) on the Rossi X-Ray Timing Explorer together with data from the Burst and Transient Source Experiment (BATSE) on the Compton Gamma-Ray Observatory to study the long-term temporal evolution of these sources in the x-ray and hard x-ray bands. The project was closely related to "Long-Term Hard X-Ray Monitoring of X-Ray Bursters", NASA project NAG5-3891, and and "Hard x-ray emission of x-ray bursters", NASA project NAG5-4633, and shares publications in common with both of these. The project involved preparation of software for use in monitoring and then the actual monitoring itself. These efforts have lead to results directly from the ASM data and also from Target of Opportunity Observations (TOO) made with the Rossi X-Ray Timing Explorer based on detection of transient hard x-ray outbursts with the ASM and BATSE.

Characterizing the X-ray Emission From Stellar Bow Shocks and Their Driving Stars with the Chandra Archive

NASA Astrophysics Data System (ADS)

Binder, Breanna

2017-09-01

We propose an archival study of 2.8 Msec of ACIS images to search for X-ray emission from stellar-wind bow shocks and to characterize the X-ray properties of their driving stars. Bow shocks, particularly those produced by runaway OB stars, are theorized to up-scatter IR photons via inverse Compton scattering, and may produce a significant fraction of high-energy photons in our Galaxy. However, their low X-ray luminosity makes direct detection difficult. By stacking 106 archival observations containing >100 bow shocks, we will create the deepest X-ray exposure of bow shocks to date. We will perform the first detailed comparison of bow shock driving stars to the general massive star population.

X-ray Heating and Electron Temperature of Laboratory Photoionized Plasmas

NASA Astrophysics Data System (ADS)

Mancini, Roberto; Lockard, Tom; Mayes, Daniel C.; Loisel, Guillaume; Bailey, James E.; Rochau, Gregory; Abdallah, J.; Golovkin, I.

2018-06-01

In separate experiments performed at the Z facility of Sandia National Laboratories two different samples were employed to produce and characterize photoionized plasmas. One was a gas cell filled with neon, and the other was a thin silicon layer coated with plastic. Both samples were driven by the broadband x-ray flux produced at the collapse of a wire array z-pinch implosion. Transmission spectroscopy of a narrowband portion of the x-ray flux was used to diagnose the charge state distribution, and the electron temperature was extracted from a Li-like ion level population ratio. To interpret the temperature measurement, we performed Boltzmann kinetics and radiation-hydrodynamic simulations. We found that non-equilibrium atomic physics and the coupling of the radiation flux to the atomic level population kinetics play a critical role in modeling the x-ray heating of photoionized plasmas. In spite of being driven by similar x-ray drives, differences of ionization and charged state distributions in the neon and silicon plasmas are reflected in the plasma heating and observed electron temperatures.This work was sponsored in part by DOE Office of Science Grant DE-SC0014451, and the Z Facility Fundamental Science Program of SNL.

Characterization of CuHal-intercalated carbon nanotubes with x-ray absorption spectroscopy combined with x-ray photoelectron and resonant photoemission spectroscopies

NASA Astrophysics Data System (ADS)

Brzhezinskaya, M.; Generalov, A.; Vinogdradov, A.; Eliseev, A.

2013-04-01

Encapsulated single-walled carbon nanotubes (SWCNTs) with inner channels filled by different compounds present the new class of composite materials. Such CNTs give opportunity to form 1D nanocrystals as well as quantum nanowires with new physical and chemical properties inside the tubes. The present study is aimed to characterize the possible chemical interaction between CuHal (Hal=I, Cl, Br) and SWCNTs in CuHal@SWCNTs and electronic structure of the latter using high-resolution near edge X-ray absorption fine structure (NEXAFS) spectroscopy combined with high-resolution X-ray photoelectron spectroscopy and resonant photoemission spectroscopy. The present study has shown that there is a chemical interaction between the filler and π-electron subsystem of CNTs which is accompanied by changes of the atomic and electronic structure of the filler during the encapsulating it inside CNTs.

Microfabricated X-Ray Optics Technology Development for the Constellation-X Mission

NASA Technical Reports Server (NTRS)

Schattenburg, Mark L.

2003-01-01

During the period of this Cooperative Agreement, MIT developed advanced methods for applying silicon micro-stuctures for the precision assembly of foil x-ray optics in support of the Constellution-X Spectroscopy X-ray Telescope (SXT) development effort at Goddard Space Flight Center (GSFC). MIT developed improved methods for fabricating and characterizing the precision silicon micro-combs. MIT also developed and characterized assembly tools and several types of metrology tools in order to characterize and reduce the errors associated with precision assembly of foil optics. Results of this effort were published and presented to the scientific community and the GSFC SXT team.

Hard X-ray mirrors for Nuclear Security

DOE Office of Scientific and Technical Information (OSTI.GOV)

Descalle, M. A.; Brejnholt, N.; Hill, R.

Research performed under this LDRD aimed to demonstrate the ability to detect and measure hard X-ray emissions using multilayer X-ray reflective optics above 400 keV, to enable the development of inexpensive and high-accuracy mirror substrates, and to investigate applications of hard X-ray mirrors of interest to the nuclear security community. Experiments conducted at the European Synchrotron Radiation Facility demonstrated hard X-ray mirror reflectivity up to 650 keV for the first time. Hard X-ray optics substrates must have surface roughness under 3 to 4 Angstrom rms, and three materials were evaluated as potential substrates: polycarbonates, thin Schott glass and a newmore » type of flexible glass called Willow Glass®. Chemical smoothing and thermal heating of the surface of polycarbonate samples, which are inexpensive but have poor intrinsic surface characteristics, did not yield acceptable surface roughness. D263 Schott glass was used for the focusing optics of the NASA NuSTAR telescope. The required specialized hardware and process were costly and motivated experiments with a modified non-contact slumping technique. The surface roughness of the glass was preserved and the process yielded cylindrical shells with good net shape pointing to the potential advantage of this technique. Finally, measured surface roughness of 200 and 130 μm thick Willow Glass sheets was between 2 and 2.5 A rms. Additional results of flexibility tests and multilayer deposition campaigns indicated it is a promising substrate for hard X-ray optics. The detection of U and Pu characteristics X-ray lines and gamma emission lines in a high background environment was identified as an area for which X-ray mirrors could have an impact and where focusing optics could help reduce signal to noise ratio by focusing signal onto a smaller detector. Hence the first one twelvetant of a Wolter I focusing optics for the 90 to 140 keV energy range based on aperiodic multilayer coating was designed

The Ultracompact Nature of the Black Hole Candidate X-Ray Binary 47 Tuc X9

NASA Technical Reports Server (NTRS)

Bahramian, Arash; Heinke, Craig O.; Tudor, Vlad; Miller-Jones, James C. A.; Bogdanov, Slavko; Maccarone, Thomas J.; Knigge, Christian; Sivakoff, Gregory R.; Chomiuk, Laura; Strader, J.;

Phased Contrast X-Ray Imaging

ScienceCinema

Miller, Erin

2018-02-07

The Pacific Northwest National Laboratory is developing a range of technologies to broaden the field of explosives detection. Phased contrast X-ray imaging, which uses silicon gratings to detect distortions in the X-ray wave front, may be applicable to mail or luggage scanning for explosives; it can also be used in detecting other contraband, small-parts inspection, or materials characterization.

Characterization of X-ray emission from laser generated plasma

NASA Astrophysics Data System (ADS)

Cannavò, Antonino; Torrisi, Lorenzo; Ceccio, Giovanni; Cutroneo, Mariapompea; Calcagno, Lucia; Sciuto, Antonella; Mazzillo, Massimo

2018-01-01

X-ray emission from laser generated plasma was studied at low (1010 W/cm2) and high (1018 W/cm2) intensity using ns and fs laser, respectively. Plasma characteristics were controlled trough the laser parameters, the irradiation conditions and the target properties. The X-ray spectra were acquired using fast detection technique based on SiC diodes with different active regions. The X-ray yield increases with the atomic number of the target, both at low and high intensity, and a similar empirical law has been obtained. The X-ray emission mechanisms from plasma are correlated to the plasma temperature and density and to the Coulomb charge particle acceleration, due to the charge separation effects produced in the non-equilibrium plasma. Functional dependences, theoretical approaches and interpretation of possible mechanism will be presented and discussed.

Stellar X-Ray Polarimetry

NASA Technical Reports Server (NTRS)

Swank, J.

2011-01-01

Most of the stellar end-state black holes, pulsars, and white dwarfs that are X-ray sources should have polarized X-ray fluxes. The degree will depend on the relative contributions of the unresolved structures. Fluxes from accretion disks and accretion disk corona may be polarized by scattering. Beams and jets may have contributions of polarized emission in strong magnetic fields. The Gravity and Extreme Magnetism Small Explorer (GEMS) will study the effects on polarization of strong gravity of black holes and strong magnetism of neutron stars. Some part of the flux from compact stars accreting from companion stars has been reflected from the companion, its wind, or accretion streams. Polarization of this component is a potential tool for studying the structure of the gas in these binary systems. Polarization due to scattering can also be present in X-ray emission from white dwarf binaries and binary normal stars such as RS CVn stars and colliding wind sources like Eta Car. Normal late type stars may have polarized flux from coronal flares. But X-ray polarization sensitivity is not at the level needed for single early type stars.

Microstructure and composition analysis of low-Z/low-Z multilayers by combining hard and resonant soft X-ray reflectivity

DOE Office of Scientific and Technical Information (OSTI.GOV)

Rao, P. N., E-mail: pnrao@rrcat.gov.in; Rai, S. K.; Srivastava, A. K.

2016-06-28

Microstructure and composition analysis of periodic multilayer structure consisting of a low electron density contrast (EDC) material combination by grazing incidence hard X-ray reflectivity (GIXR), resonant soft X-ray reflectivity (RSXR), and transmission electron microscopy (TEM) are presented. Measurements of reflectivity at different energies allow combining the sensitivity of GIXR data to microstructural parameters like layer thicknesses and interfacing roughness, with the layer composition sensitivity of RSXR. These aspects are shown with an example of 10-period C/B{sub 4}C multilayer. TEM observation reveals that interfaces C on B{sub 4}C and B{sub 4}C on C are symmetric. Although GIXR provides limited structural informationmore » when EDC between layers is low, measurements using a scattering technique like GIXR with a microscopic technique like TEM improve the microstructural information of low EDC combination. The optical constants of buried layers have been derived by RSXR. The derived optical constants from the measured RSXR data suggested the presence of excess carbon into the boron carbide layer.« less

Characterization of spectrometric photon-counting X-ray detectors at different pitches

NASA Astrophysics Data System (ADS)

Jurdit, M.; Brambilla, A.; Moulin, V.; Ouvrier-Buffet, P.; Radisson, P.; Verger, L.

2017-09-01

There is growing interest in energy-sensitive photon-counting detectors based on high flux X-ray imaging. Their potential applications include medical imaging, non-destructive testing and security. Innovative detectors of this type will need to count individual photons and sort them into selected energy bins, at several million counts per second and per mm2. Cd(Zn)Te detector grade materials with a thickness of 1.5 to 3 mm and pitches from 800 μm down to 200 μm were assembled onto interposer boards. These devices were tested using in-house-developed full-digital fast readout electronics. The 16-channel demonstrators, with 256 energy bins, were experimentally characterized by determining spectral resolution, count rate, and charge sharing, which becomes challenging at low pitch. Charge sharing correction was found to efficiently correct X-ray spectra up to 40 × 106 incident photons.s-1.mm-2.

Characterization of ion-induced radiation effects in nuclear materials using synchrotron x-ray techniques

DOE PAGES

Lang, Maik; Tracy, Cameron L.; Palomares, Raul I.; ...

2015-05-01

Recent efforts to characterize the nanoscale structural and chemical modifications induced by energetic ion irradiation in nuclear materials have greatly benefited from the application of synchrotron-based x-ray diffraction (XRD) and x-ray absorption spectroscopy (XAS) techniques. Key to the study of actinide-bearing materials has been the use of small sample volumes, which are particularly advantageous, as the small quantities minimize the level of radiation exposure at the ion-beam and synchrotron user facility. This approach utilizes energetic heavy ions (energy range: 100 MeV–3 GeV) that pass completely through the sample thickness and deposit an almost constant energy per unit length along theirmore » trajectory. High energy x-rays (25–65 keV) from intense synchrotron light sources are then used in transmission geometry to analyze ion-induced structural and chemical modifications throughout the ion tracks. We describe in detail the experimental approach for utilizing synchrotron radiation (SR) to study the radiation response of a range of nuclear materials (e.g., ThO 2 and Gd 2Ti xZr 2–xO 7). Also addressed is the use of high-pressure techniques, such as the heatable diamond anvil cell, as a new means to expose irradiated materials to well-controlled high-temperature (up to 1000 °C) and/or high-pressure (up to 50 GPa) conditions. Furthermore, this is particularly useful for characterizing the annealing kinetics of irradiation-induced material modifications.« less

Soft x-ray reduction camera for submicron lithography

DOEpatents

Hawryluk, A.M.; Seppala, L.G.

1991-03-26

Soft x-ray projection lithography can be performed using x-ray optical components and spherical imaging lenses (mirrors), which form an x-ray reduction camera. The x-ray reduction is capable of projecting a 5x demagnified image of a mask onto a resist coated wafer using 4.5 nm radiation. The diffraction limited resolution of this design is about 135 nm with a depth of field of about 2.8 microns and a field of view of 0.2 cm[sup 2]. X-ray reflecting masks (patterned x-ray multilayer mirrors) which are fabricated on thick substrates and can be made relatively distortion free are used, with a laser produced plasma for the source. Higher resolution and/or larger areas are possible by varying the optic figures of the components and source characteristics. 9 figures.

Testing the Kerr Black Hole Hypothesis Using X-Ray Reflection Spectroscopy

DOE Office of Scientific and Technical Information (OSTI.GOV)

Bambi, Cosimo; Nampalliwar, Sourabh; Cárdenas-Avendaño, Alejandro

We present the first X-ray reflection model for testing the assumption that the metric of astrophysical black holes is described by the Kerr solution. We employ the formalism of the transfer function proposed by Cunningham. The calculations of the reflection spectrum of a thin accretion disk are split into two parts: the calculation of the transfer function and the calculation of the local spectrum at any emission point in the disk. The transfer function only depends on the background metric and takes into account all the relativistic effects (gravitational redshift, Doppler boosting, and light bending). Our code computes the transfermore » function for a spacetime described by the Johannsen metric and can easily be extended to any stationary, axisymmetric, and asymptotically flat spacetime. Transfer functions and single line shapes in the Kerr metric are compared to those calculated from existing codes to check that we reach the necessary accuracy. We also simulate some observations with NuSTAR and LAD/eXTP and fit the data with our new model to show the potential capabilities of current and future observations to constrain possible deviations from the Kerr metric.« less

Characterization of temporal coherence of hard X-ray free-electron laser pulses with single-shot interferograms

DOE Office of Scientific and Technical Information (OSTI.GOV)

Osaka, Taito; Hirano, Takashi; Morioka, Yuki

Temporal coherence is one of the most fundamental characteristics of light, connecting to spectral information through the Fourier transform relationship between time and frequency. Interferometers with a variable path-length difference (PLD) between the two branches have widely been employed to characterize temporal coherence properties for broad spectral regimes. Hard X-ray interferometers reported previously, however, have strict limitations in their operational photon energies, due to the specific optical layouts utilized to satisfy the stringent requirement for extreme stability of the PLD at sub-ångström scales. The work presented here characterizes the temporal coherence of hard X-ray free-electron laser (XFEL) pulses by capturingmore » single-shot interferograms. Since the stability requirement is drastically relieved with this approach, it was possible to build a versatile hard X-ray interferometer composed of six separate optical elements to cover a wide photon energy range from 6.5 to 11.5 keV while providing a large variable delay time of up to 47 ps at 10 keV. A high visibility of up to 0.55 was observed at a photon energy of 10 keV. The visibility measurement as a function of time delay reveals a mean coherence time of 5.9 ± 0.7 fs, which agrees with that expected from the single-shot spectral information. In conclusion, this is the first result of characterizing the temporal coherence of XFEL pulses in the hard X-ray regime and is an important milestone towards ultra-high energy resolutions at micro-electronvolt levels in time-domain X-ray spectroscopy, which will open up new opportunities for revealing dynamic properties in diverse systems on timescales from femtoseconds to nanoseconds, associated with fluctuations from ångström to nanometre spatial scales.« less

Characterization of temporal coherence of hard X-ray free-electron laser pulses with single-shot interferograms

DOE PAGES

Osaka, Taito; Hirano, Takashi; Morioka, Yuki; ...

2017-10-13

Temporal coherence is one of the most fundamental characteristics of light, connecting to spectral information through the Fourier transform relationship between time and frequency. Interferometers with a variable path-length difference (PLD) between the two branches have widely been employed to characterize temporal coherence properties for broad spectral regimes. Hard X-ray interferometers reported previously, however, have strict limitations in their operational photon energies, due to the specific optical layouts utilized to satisfy the stringent requirement for extreme stability of the PLD at sub-ångström scales. The work presented here characterizes the temporal coherence of hard X-ray free-electron laser (XFEL) pulses by capturingmore » single-shot interferograms. Since the stability requirement is drastically relieved with this approach, it was possible to build a versatile hard X-ray interferometer composed of six separate optical elements to cover a wide photon energy range from 6.5 to 11.5 keV while providing a large variable delay time of up to 47 ps at 10 keV. A high visibility of up to 0.55 was observed at a photon energy of 10 keV. The visibility measurement as a function of time delay reveals a mean coherence time of 5.9 ± 0.7 fs, which agrees with that expected from the single-shot spectral information. In conclusion, this is the first result of characterizing the temporal coherence of XFEL pulses in the hard X-ray regime and is an important milestone towards ultra-high energy resolutions at micro-electronvolt levels in time-domain X-ray spectroscopy, which will open up new opportunities for revealing dynamic properties in diverse systems on timescales from femtoseconds to nanoseconds, associated with fluctuations from ångström to nanometre spatial scales.« less

X-ray photoelectron spectroscopy for characterization of wood surfaces in adhesion studies

Treesearch

James F. Beecher; Charles R. Frihart

2005-01-01

X-ray photoelectron spectroscopy (XPS) is one of a set of tools that have been used to characterize wood surfaces. Among the advantages of XPS are surface sensitivity, identification of nearly all elements, and frequently, discrimination of bonding states. For these reasons, XPS seemed to be an appropriate tool to help explain the differences in bond strength under wet...

Testing the Performance and Accuracy of the RELXILL Model for the Relativistic X-Ray Reflection from Accretion Disks

NASA Astrophysics Data System (ADS)

Choudhury, Kishalay; García, Javier A.; Steiner, James F.; Bambi, Cosimo

2017-12-01

The reflection spectroscopic model RELXILL is commonly implemented in studying relativistic X-ray reflection from accretion disks around black holes. We present a systematic study of the model’s capability to constrain the dimensionless spin and ionization parameters from ∼6000 Nuclear Spectroscopic Telescope Array (NuSTAR) simulations of a bright X-ray source employing the lamp-post geometry. We employ high-count spectra to show the limitations in the model without being confused with limitations in signal-to-noise. We find that both parameters are well-recovered at 90% confidence with improving constraints at higher reflection fraction, high spin, and low source height. We test spectra across a broad range—first at 106–107 and then ∼105 total source counts across the effective 3–79 keV band of NuSTAR, and discover a strong dependence of the results on how fits are performed around the starting parameters, owing to the complexity of the model itself. A blind fit chosen over an approach that carries some estimates of the actual parameter values can lead to significantly worse recovery of model parameters. We further stress the importance to span the space of nonlinear-behaving parameters like {log} ξ carefully and thoroughly for the model to avoid misleading results. In light of selecting fitting procedures, we recall the necessity to pay attention to the choice of data binning and fit statistics used to test the goodness of fit by demonstrating the effect on the photon index Γ. We re-emphasize and implore the need to account for the detector resolution while binning X-ray data and using Poisson fit statistics instead while analyzing Poissonian data.

A simple solution to systematic errors in density determination by X-ray reflectivity: The XRR-density evaluation (XRR-DE) method

NASA Astrophysics Data System (ADS)

Bergese, P.; Bontempi, E.; Depero, L. E.

2006-10-01

X-ray reflectivity (XRR) is a non-destructive, accurate and fast technique for evaluating film density. Indeed, sample-goniometer alignment is a critical experimental factor and the overriding error source in XRR density determination. With commercial single-wavelength X-ray reflectometers, alignment is difficult to control and strongly depends on the operator. In the present work, the contribution of misalignment on density evaluation error is discussed, and a novel procedure (named XRR-density evaluation or XRR-DE method) to minimize the problem will be presented. The method allows to overcome the alignment step through the extrapolation of the correct density value from appropriate non-specular XRR data sets. This procedure is operator independent and suitable for commercial single-wavelength X-ray reflectometers. To test the XRR-DE method, single crystals of TiO 2 and SrTiO 3 were used. In both cases the determined densities differed from the nominal ones less than 5.5%. Thus, the XRR-DE method can be successfully applied to evaluate the density of thin films for which only optical reflectivity is today used. The advantage is that this method can be considered thickness independent.

STRONGER REFLECTION FROM BLACK HOLE ACCRETION DISKS IN SOFT X-RAY STATES

DOE Office of Scientific and Technical Information (OSTI.GOV)

Steiner, James F.; Remillard, Ronald A.; García, Javier A.

We analyze 15,000 spectra of 29 stellar-mass black hole (BH) candidates collected over the 16 year mission lifetime of Rossi X-ray Timing Explorer using a simple phenomenological model. As these BHs vary widely in luminosity and progress through a sequence of spectral states, which we broadly refer to as hard and soft, we focus on two spectral components: the Compton power law and the reflection spectrum it generates by illuminating the accretion disk. Our proxy for the strength of reflection is the equivalent width of the Fe–K line as measured with respect to the power law. A key distinction ofmore » our work is that for all states we estimate the continuum under the line by excluding the thermal disk component and using only the component that is responsible for fluorescing the Fe–K line, namely, the Compton power law. We find that reflection is several times more pronounced (∼3) in soft compared to hard spectral states. This is most readily caused by the dilution of the Fe line amplitude from Compton scattering in the corona, which has a higher optical depth in hard states. Alternatively, this could be explained by a more compact corona in soft (compared to hard) states, which would result in a higher reflection fraction.« less

History of Chandra X-Ray Observatory

NASA Image and Video Library

2001-01-10

This Chandra image, the first x-ray image ever made of Venus, shows a half crescent due to the relative orientation of the Sun, Earth, and Venus. The x-rays are produced by fluorescent radiation from oxygen and other atoms in the atmosphere between 120 and 140 kilometers above the surface of the planet. In contrast, the optical light from Venus is caused by the reflection from clouds 50 to 70 kilometers above the surface.

X-Ray Standing Waves on Surfaces

DTIC Science & Technology

1993-01-01

dependent distributional changes of iodine on Pt 6.3 X-ray standing wave study of a Langmuir - Blodgett multilayer film 7. Conclusions 8. Acknowledgments...4B. 6.3 X-ray standing wave study of a Langmuir - Blodgett multilayer film As mentioned previously the total external reflection condition occurs...for a Zn atom layer embedded in the top arachidate bilayer of a Langmuir - Blodgett (LB) multilayer film which was deposited on the surface of a gold

Performance of NICER flight x-ray concentrator

NASA Astrophysics Data System (ADS)

Okajima, Takashi; Soong, Yang; Balsamo, Erin R.; Enoto, Teruaki; Olsen, Larry; Koenecke, Richard; Lozipone, Larry; Kearney, John; Fitzsimmons, Sean; Numata, Ai; Kenyon, Steven J.; Arzoumanian, Zaven; Gendreau, Keith

2016-07-01

Neutron star Interior Composition ExploreR (NICER) is a NASA instrument to be onboard International Space Station, which is equipped with 56 pairs of an X-ray concentrator (XRC) and a silicon drift detector for high timing observations. The XRC is based on an epoxy replicated thin aluminum foil X-ray mirror, similar to those of Suzaku and ASTRO-H (Hitomi), but only a single stage parabolic grazing incidence optic. Each has a focal length of 1.085m and a diameter of 105 mm, with 24 confocally aligned parabolic shells. Grazing incident angles to individual shells range from 0.4 to 1.4 deg. The flight 56 XRCs have been completed and successfully delivered to the payload integration. All the XRC was characterized at the NASA/GSFC 100-m X-ray beamline using 1.5 keV X-rays (some of them are also at 4.5 keV). The XRC performance, effective area and point spread function, was measured by a CCD camera and a proportional counter. The average effective area is about 44 cm2 at 1.5 keV and about 18 cm2 at 4.5 keV, which is consistent with a micro-roughness of 0.5nm from individual shell reflectivity measurements. The XRC focuses about 91% of X-rays into a 2mm aperture at the focal plane, which is the NICER detector window size. Each XRC weighs only 325 g. These performance met the project requirement. In this paper, we will present summary of the flight XRC performance as well as co-alignment results of the 56 XRCs on the flight payload as it is important to estimate the total effective for astronomical observations.

SPECTRAL SURVEY OF X-RAY BRIGHT ACTIVE GALACTIC NUCLEI FROM THE ROSSI X-RAY TIMING EXPLORER

DOE Office of Scientific and Technical Information (OSTI.GOV)

Rivers, Elizabeth; Markowitz, Alex; Rothschild, Richard, E-mail: erivers@ucsd.edu

2011-03-15

Using long-term monitoring data from the Rossi X-ray Timing Explorer (RXTE), we have selected 23 active galactic nuclei (AGNs) with sufficient brightness and overall observation time to derive broadband X-ray spectra from 3 to {approx}>100 keV. Our sample includes mainly radio-quiet Seyferts, as well as seven radio-loud sources. Given the longevity of the RXTE mission, the greater part of our data is spread out over more than a decade, providing truly long-term average spectra and eliminating inconsistencies arising from variability. We present long-term average values of absorption, Fe line parameters, Compton reflection strengths, and photon indices, as well as fluxesmore » and luminosities for the hard and very hard energy bands, 2-10 keV and 20-100 keV, respectively. We find tentative evidence for high-energy rollovers in three of our objects. We improve upon previous surveys of the very hard X-ray energy band in terms of accuracy and sensitivity, particularly with respect to confirming and quantifying the Compton reflection component. This survey is meant to provide a baseline for future analysis with respect to the long-term averages for these sources and to cement the legacy of RXTE, and especially its High Energy X-ray Timing Experiment, as a contributor to AGN spectral science.« less

X-ray tube with magnetic electron steering

DOEpatents

Reed, Kim W.; Turman, Bobby N.; Kaye, Ronald J.; Schneider, Larry X.

2000-01-01

An X-ray tube uses a magnetic field to steer electrons. The magnetic field urges electrons toward the anode, increasing the proportion of electrons emitted from the cathode that reach desired portions of the anode and consequently contribute to X-ray production. The magnetic field also urges electrons reflected from the anode back to the anode, further increasing the efficiency of the tube.

X-ray filter for x-ray powder diffraction

DOE Office of Scientific and Technical Information (OSTI.GOV)

Sinsheimer, John Jay; Conley, Raymond P.; Bouet, Nathalie C. D.

Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and wallsmore » defining second slits. The second slits may include arc shaped openings through the second plate. The walls of the second plate may be configured to absorb at least some of second x-rays and to output third x-rays.« less

Polarization and long-term variability of Sgr A* X-ray echo

NASA Astrophysics Data System (ADS)

Churazov, E.; Khabibullin, I.; Ponti, G.; Sunyaev, R.

2017-06-01

We use a model of the molecular gas distribution within ˜100 pc from the centre of the Milky Way (Kruijssen, Dale & Longmore) to simulate time evolution and polarization properties of the reflected X-ray emission, associated with the past outbursts from Sgr A*. While this model is too simple to describe the complexity of the true gas distribution, it illustrates the importance and power of long-term observations of the reflected emission. We show that the variable part of X-ray emission observed by Chandra and XMM-Newton from prominent molecular clouds is well described by a pure reflection model, providing strong support of the reflection scenario. While the identification of Sgr A* as a primary source for this reflected emission is already a very appealing hypothesis, a decisive test of this model can be provided by future X-ray polarimetric observations, which will allow placing constraints on the location of the primary source. In addition, X-ray polarimeters (like, e.g. XIPE) have sufficient sensitivity to constrain the line-of-sight positions of molecular complexes, removing major uncertainty in the model.

Long Periodic Structure of a Room-Temperature Ionic Liquid by High-Pressure Small-Angle X-Ray Scattering and Wide-Angle X-Ray Scattering: 1-Decyl-3-Methylimidazolium Chloride.

PubMed

Abe, Hiroshi; Hamaya, Nozomu; Koyama, Yoshihiro; Kishimura, Hiroaki; Takekiyo, Takahiro; Yoshimura, Yukihiro; Wakabayashi, Daisuke; Funamori, Nobumasa; Matsuishi, Kiyoto

2018-04-23

The Bragg reflections of 1-decyl-3-methylimidazolium chloride ([C 10 mim][Cl]), a room-temperature ionic liquid, are observed in a lowly scattered wavevector (q) region using high-pressure (HP) small-angle X-ray scattering methods. The HP crystal of [C 10 mim][Cl] was characterized by an extremely long periodic structure. The peak position at the lowest q (1.4 nm -1 ) was different from that of the prepeak observed in the liquid state (2.3 nm -1 ). Simultaneously, Bragg reflections at high-q were detected using HP wide-angle X-ray scattering. The longest lattice constant was estimated to be 4.3 nm using structural analysis. The crystal structure of HP differed from that of the low-temperature (LT) crystal and the LT liquid crystal. With increasing pressure, Bragg reflections in the high-q component became much broader, and were accompanied by phase transition, although those in the low-q component were observed to be relatively sharp. © 2018 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

Chandra X-Ray Observatory Image of Black Hole

NASA Technical Reports Server (NTRS)

2000-01-01

This Chandra X-Ray Observatory (CXO) image is a spectrum of a black hole, which is similar to the colorful spectrum of sunlight produced by a prism. The x-rays of interest are shown here recorded in bright stripes that run rightward and leftward from the center of the image. These x-rays are sorted precisely according to their energy with the highest-energy x-rays near the center of the image and the lower-energy x-rays farther out. The spectrum was obtained by using the Low Energy Transmission Grating (LETG), which intercepts x-rays and changes their direction by the amounts that depend sensitively on the x-ray energy. The assembly holds 540 gold transmission gratings. When in place behind the mirrors, the gratings intercept the x-rays reflected from the telescope. The bright spot at the center is due to a fraction of the x-ray radiation that is not deflected by the LETG. The spokes that intersect the central spot and the faint diagonal rays that flank the spectrum itself are artifacts due to the structure that supports the LETG grating elements. (Photo credit: NASA Cfa/J. McClintock et al)

Automatic tool alignment in a backscatter X-ray scanning system

DOEpatents

Garretson, Justin; Hobart, Clinton G.; Gladwell, Thomas S.; Monda, Mark J.

2015-11-17

Technologies pertaining to backscatter x-ray scanning systems are described herein. The backscatter x-ray scanning system includes an x-ray source, which directs collimated x-rays along a plurality of output vectors towards a target. A detector detects diffusely reflected x-rays subsequent to respective collimated x-rays impacting the target, and outputs signals indicative of parameters of the detected x-rays. An image processing system generates an x-ray image based upon parameters of the detected x-rays, wherein each pixel in the image corresponds to a respective output vector. A user selects a particular portion of the image, and a medical device is positioned such that its directional axis is coincident with the output vector corresponding to at least one pixel in the portion of the image.

Automatic tool alignment in a backscatter x-ray scanning system

DOEpatents

Garretson, Justin; Hobart, Clinton G.; Gladwell, Thomas S.; Monda, Mark J.

2015-06-16

Technologies pertaining to backscatter x-ray scanning systems are described herein. The backscatter x-ray scanning system includes an x-ray source, which directs collimated x-rays along a plurality of output vectors towards a target. A detector detects diffusely reflected x-rays subsequent to respective collimated x-rays impacting the target, and outputs signals indicative of parameters of the detected x-rays. An image processing system generates an x-ray image based upon parameters of the detected x-rays, wherein each pixel in the image corresponds to a respective output vector. A user selects a particular portion of the image, and a tool is positioned such that its directional axis is coincident with the output vector corresponding to at least one pixel in the portion of the image.

Design, Fabrication and Testing of Multilayer Coated X-Ray Optics for the Water Window Imaging X-Ray Microscope

NASA Technical Reports Server (NTRS)

Spencer, Dwight C.

1996-01-01

Hoover et. al. built and tested two imaging Schwarzschild multilayer microscopes. These instruments were constructed as prototypes for the "Water Window Imaging X-Ray Microscope," which is a doubly reflecting, multilayer x-ray microscope configured to operate within the "water window." The "water window" is the narrow region of the x-ray spectrum between the K absorption edges of oxygen (lamda = 23.3 Angstroms) and of carbon (lamda = 43.62 Angstroms), where water is relatively highly transmissive and carbon is highly absorptive. This property of these materials, thus permits the use of high resolution multilayer x-ray microscopes for producing high contrast images of carbon-based structures within the aqueous physiological environments of living cells. We report the design, fabrication and testing of multilayer optics that operate in this regime.

Accretion torques in X-ray pulsars

NASA Technical Reports Server (NTRS)

Rappaport, S.; Joss, P. C.

1977-01-01

An analysis of the accretion process in an X-ray pulsar, whereby angular momentum is transferred to the star and its rotation period is changed, is presented, and an expression for the fractional rate of change of the pulse period in terms of X-ray luminosity and other star parameters is derived. It is shown that observed characteristic spin-up time scales for seven X-ray pulsars strongly support the view that in every source (1) the pulse period reflects the rotation period of a compact object, (2) the accretion is mediated by a disk surrounding the compact object and rotating in the same sense, and (3) the compact object is a neutron star rather than a white dwarf.

Quantitative characterization of fatty liver disease using x-ray scattering

NASA Astrophysics Data System (ADS)

Elsharkawy, Wafaa B.; Elshemey, Wael M.

2013-11-01

Nonalcoholic fatty liver disease (NAFLD) is a dynamic condition in which fat abnormally accumulates within the hepatocytes. It is believed to be a marker of risk of later chronic liver diseases, such as liver cirrhosis and carcinoma. The fat content in liver biopsies determines its validity for liver transplantation. Transplantation of livers with severe NAFLD is associated with a high risk of primary non-function. Moreover, NAFLD is recognized as a clinically important feature that influences patient morbidity and mortality after hepatic resection. Unfortunately, there is a lack in a precise, reliable and reproducible method for quantification of NAFLD. This work suggests a method for the quantification of NAFLD. The method is based on the fact that fatty liver tissue would have a characteristic x-ray scattering profile with a relatively intense fat peak at a momentum transfer value of 1.1 nm-1 compared to a soft tissue peak at 1.6 nm-1. The fat content in normal and fatty liver is plotted against three profile characterization parameters (ratio of peak intensities, ratio of area under peaks and ratio of area under fat peak to total profile area) for measured and Monte Carlo simulated x-ray scattering profiles. Results show a high linear dependence (R2>0.9) of the characterization parameters on the liver fat content with a reported high correlation coefficient (>0.9) between measured and simulated data. These results indicate that the current method probably offers reliable quantification of fatty liver disease.

Advances in X-ray Mapping for Characterization of Microstructures: Silicon Drift Detectors, Microcalorimeters, X-ray Spectrum Imaging, and Data Mining

NASA Astrophysics Data System (ADS)

Newbury, D. E.

2006-05-01

X-ray mapping, performed with the electron probe microanalyzer (EPMA) or scanning electron microscope/energy dispersive x-ray spectrometer (SEM/EDS), is one of the most popular modes of studying chemically heterogeneous microstructures [1]. Despite the maturity of the technique, now in its 50th anniversary year [2], recent remarkable advances in instrumentation and software will provide microanalysts with an even more effective and efficient microstructural characterization tool: (1) Increased x-ray mapping speed: The silicon drift detector (SDD) [3] is a new form of the familiar silicon EDS that uses the same detection physics but with a radically different design that outperforms the classic Si-EDS in nearly every way [4]: (1) the SDD operates requires only Peltier cooling to -20 oC to - 50 oC; (2) for a given detector active area, the SDD has superior resolution; (3) the SDD achieves the same resolution but with a peaking time that is 5 to 8 times faster; and (4) maximum output count rate (OCR) ranges from about 14 kHz at optimum resolution (134 eV at MnKa for a 50 mm2 area) to 500 kHz (217 eV). This OCR performance enables rapid x-ray mapping collection in the x-ray spectrum image (XSI) mode, in which a complete EDS spectrum (2048 10eV-channels) is captured at each pixel (e.g., 10 ms dwell with 1.3 ms overhead per pixel, or 185 seconds for a 128x128 pixel map). XSI collection captures all possible spectral information within the limits imposed by the spectrometer and the primary beam dose. (2) EDS with WDS resolution: The microcalorimeter EDS measures the temperature rise when a single x-ray photon is absorbed in a metal target [5]. Demonstrated resolution is 4.5 eV at Mn Ka for a broad energy range (0.2 - 10 keV) spectrometer and 2 eV (AlKa) for a low photon energy range (0.2 - 2.0 keV) version. The low energy spectrometer is sensitive to peak shape and position changes associated with chemical bonding, opening the possibility of EDS chemical-state mapping. (3

Study of the Au-Cr bilayer system using X-ray reflectivity, GDOES, and ToF-SIMS

DOE PAGES

Jonnard, Philippe; Modi, Mohammed H.; Le Guen, Karine; ...

2018-04-17

Here, we study a Au (25 nm)/Cr (10 nm) bilayer system as a model of mirror for the soft X–ray energy range. The Au and Cr thin films are a few nanometer thick and are deposited on a float glass substrate. The sample is characterized by using 3 complementary techniques: soft X–ray reflectivity, glow discharge optical emission spectrometry (GDOES), and time–of–flight secondary ion mass spectroscopy (ToF–SIMS). Soft X–ray reflectivity provides information about the thickness and roughness of the different layers, while GDOES is used to obtain the elemental depth profile of the stack and ToF–SIMS to obtain the elemental andmore » chemical depth profiles. GDOES and ToF–SIMS have both a nanometer depth resolution. A coherent description of the bilayer stack is obtained through the combination of these techniques. It consists in 5 layers namely a surface contamination layer, a principal gold layer, a Au–Cr mixed layer, a Cr layer, and another contamination layer at the top of the substrate.« less

Study of the Au-Cr bilayer system using X-ray reflectivity, GDOES, and ToF-SIMS

DOE Office of Scientific and Technical Information (OSTI.GOV)

Jonnard, Philippe; Modi, Mohammed H.; Le Guen, Karine

Here, we study a Au (25 nm)/Cr (10 nm) bilayer system as a model of mirror for the soft X–ray energy range. The Au and Cr thin films are a few nanometer thick and are deposited on a float glass substrate. The sample is characterized by using 3 complementary techniques: soft X–ray reflectivity, glow discharge optical emission spectrometry (GDOES), and time–of–flight secondary ion mass spectroscopy (ToF–SIMS). Soft X–ray reflectivity provides information about the thickness and roughness of the different layers, while GDOES is used to obtain the elemental depth profile of the stack and ToF–SIMS to obtain the elemental andmore » chemical depth profiles. GDOES and ToF–SIMS have both a nanometer depth resolution. A coherent description of the bilayer stack is obtained through the combination of these techniques. It consists in 5 layers namely a surface contamination layer, a principal gold layer, a Au–Cr mixed layer, a Cr layer, and another contamination layer at the top of the substrate.« less

Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy

PubMed Central

Nho, Hyun Woo; Kalegowda, Yogesh; Shin, Hyun-Joon; Yoon, Tae Hyun

2016-01-01

For the structural characterization of the polystyrene (PS)-based photonic crystals (PCs), fast and direct imaging capabilities of full field transmission X-ray microscopy (TXM) were demonstrated at soft X-ray energy. PS-based PCs were prepared on an O2-plasma treated Si3N4 window and their local structures and defects were investigated using this label-free TXM technique with an image acquisition speed of ~10 sec/frame and marginal radiation damage. Micro-domains of face-centered cubic (FCC (111)) and hexagonal close-packed (HCP (0001)) structures were dominantly found in PS-based PCs, while point and line defects, FCC (100), and 12-fold symmetry structures were also identified as minor components. Additionally, in situ observation capability for hydrated samples and 3D tomographic reconstruction of TXM images were also demonstrated. This soft X-ray full field TXM technique with faster image acquisition speed, in situ observation, and 3D tomography capability can be complementally used with the other X-ray microscopic techniques (i.e., scanning transmission X-ray microscopy, STXM) as well as conventional characterization methods (e.g., electron microscopic and optical/fluorescence microscopic techniques) for clearer structure identification of self-assembled PCs and better understanding of the relationship between their structures and resultant optical properties. PMID:27087141

Evaluation of alignment error of micropore X-ray optics caused by hot plastic deformation

NASA Astrophysics Data System (ADS)

Numazawa, Masaki; Ishi, Daiki; Ezoe, Yuichiro; Takeuchi, Kazuma; Terada, Masaru; Fujitani, Maiko; Ishikawa, Kumi; Nakajima, Kazuo; Morishita, Kohei; Ohashi, Takaya; Mitsuda, Kazuhisa; Nakamura, Kasumi; Noda, Yusuke

2018-06-01

We report on the evaluation and characterization of micro-electromechanical system (MEMS) X-ray optics produced by silicon dry etching and hot plastic deformation. Sidewalls of micropores formed by etching through a silicon wafer are used as X-ray reflecting mirrors. The wafer is deformed into a spherical shape to focus parallel incidence X-rays. We quantitatively evaluated a mirror alignment error using an X-ray pencil beam (Al Kα line at 1.49 keV). The deviation angle caused only by the deformation was estimated from angular shifts of the X-ray focusing point before and after the deformation to be 2.7 ± 0.3 arcmin on average within the optics. This gives an angular resolution of 12.9 ± 1.4 arcmin in half-power diameter (HPD). The surface profile of the deformed optics measured using a NH-3Ns surface profiler (Mitaka Kohki) also indicated that the resolution was 11.4 ± 0.9 arcmin in HPD, suggesting that we can simply evaluate the alignment error caused by the hot plastic deformation.

Probing Galactic Center Cosmic-Rays in the X-ray Regime

NASA Astrophysics Data System (ADS)

Zhang, Shuo; Baganoff, Frederick K.; Bulbul, Esra; Miller, Eric D.; Bautz, Mark W.

2017-08-01

The central few hundred parsecs of the Galaxy harbors 5-10% of the molecular gas mass of the entire Milky Way. This central molecular zone exhibits 6.4 keV Fe Kα line and continuum X-ray emission with time-variability. The time-variable X-ray emission from the gas clouds is best explained by light echoes of past X-ray outbursts from the central supermassive black hole Sgr A*. However,MeV-GeV cosmic-ray particles may also contribute to a constant X-ray emission component from the clouds, through collisional ionization and bremsstrahlung. Sgr B2 is the densest and most massive cloud in the central molecular zone. It is the only known gas cloud whose X-ray emission has kept fading over the past decade and will soon reach a constant X-ray level in 2017/2018, and thus serves as the best probe for MeV-GeV particles in the central 100 pc of the Galaxy. At the same time, the Fe Kα emission has also been discovered from molecular structures beyond the central molecular zone, extening to ~1 kpc from the Galactic center. The X-ray reflection scenario meets challenges this far from the Galactic center, while the MeV-GeV cosmic-ray electrons serve as a more natural explanation. Our studies on Sgr B2 and the large-scale moleuclar structures will for the first time constrain the MeV-GeV particles in the Galactic center, and point to their origin: whether they rise from particle acceleration or dark matter annihilation.

X ray microscope assembly and alignment support and advanced x ray microscope design and analysis

NASA Technical Reports Server (NTRS)

Shealy, David L.

1991-01-01

Considerable efforts have been devoted recently to the design, analysis, fabrication, and testing of spherical Schwarzschild microscopes for soft x ray application in microscopy and projection lithography. The spherical Schwarzschild microscope consists of two concentric spherical mirrors configured such that the third order spherical aberration and coma are zero. Since multilayers are used on the mirror substrates for x ray applications, it is desirable to have only two reflecting surfaces in a microscope. In order to reduce microscope aberrations and increase the field of view, generalized mirror surface profiles have been considered in this investigation. Based on incoherent and sine wave modulation transfer function (MTF) calculations, the object plane resolution of a microscope has been analyzed as a function of the object height and numerical aperture (NA) of the primary for several spherical Schwarzschild, conic, and aspherical head reflecting two mirror microscope configurations.

Performance and Characterization of Magnetic Penetration Thermometer Devices for X-Ray Spectroscopy

NASA Technical Reports Server (NTRS)

Porst, J. -P.; Adams, J. S.; Bandler, S. R.; Balvin, M.; Busch, S. E.; Denis, K. L.; Kelly, D.; Nagler, P.; Sadleir, J. E.; Seidel, G. M.;

Methods for Reducing Singly Reflected Rays on the Wolter-I Focusing Figures of the FOXSI Rocket Experiment

NASA Technical Reports Server (NTRS)

Buitrago-Casas, Juan Camilo; Glesener, Lindsay; Christe, Steven; Elsner, Ronald; Ramsey, Brian; Courtade, Sasha; Ishikawa, Shin-nosuke; Narukage, Noriyuki; Vievering, Juliana; Subramania, Athiray;

The Experimental Study of Characterized Noble Gas Puffs Irradiated by Ultra-Short Laser Pulses Compared with X-Pinches as an X-Ray Source

NASA Astrophysics Data System (ADS)

Schultz, Kimberly Ann

The goal of this dissertation is to study the basic physics and X-ray emission (1-10 keV) of two X-ray sources: X-pinch plasmas and a clustered gas-puff irradiated by an ultrashort laser pulse. X-pinches and other typical X-ray sources using solid targets create hot debris that can damage sensitive equipment. Therefore, to perform sensitive backlighting or X-ray effects testing, debris-free sources of radiation must be investigated. In this work, the author presents a broad study of clustered noble gas puffs including characterization measurements and laser heating experiments using several gas nozzles and multiple gases. Ultimately, the goal is to compare the laser-irradiated gas-puff and X-pinch plasmas as X-ray sources. Characterization of the gas puffs is performed at the Radiation Physics Laboratory at the University of Nevada, Reno (UNR) Physics Department using optical interferometry and Rayleigh scattering to determine density and cluster radius. By changing the gas-puff variables control of both the density and cluster size of the gas jets is obtained. Two laser systems provide the high intensities desired for the laser-irradiated gas puff experiments: the UNR Leopard Laser (1-2x1019 W/cm2) and the Lawrence Livermore National Laboratory's Titan Laser (7x1019 W/cm2). X-ray emission is studied as a function of laser pulse parameters, gas target type, gas puff density, and the gas-delay timing between puff initiation and laser interaction with the puff. The tested gases are Ar, Kr, Xe, and four mixtures of the noble gases. Time-resolved X-ray measurements are captured with Silicon diodes and photoconducting diamond detectors. Electron beam detectors include Faraday cups and a high-energy (> 1 MeV) electron spectrometer. Modeling of spectra from X-ray crystal spectrometers provides plasma density and temperature measurement and a molecular dynamics (MD) code describes cluster interactions with the laser pulse. The conversion of laser energy into X rays is also

Surface studies of solids using integral X-ray-induced photoemission yield

PubMed Central

Stoupin, Stanislav; Zhernenkov, Mikhail; Shi, Bing

2016-01-01

X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permit extraction of thicknesses of individual layers. The approach does not require detection of the reflected radiation and can be considered as a framework for non-invasive evaluation of buried layers with hard X-rays under grazing incidence. PMID:27874041

Surface studies of solids using integral x-ray-induced photoemission yield

DOE PAGES

Stoupin, Stanislav; Zhernenkov, Mikhail; Shi, Bing

2016-11-22

X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permitmore » extraction of thicknesses of individual layers. The approach does not require detection of the reflected radiation and can be considered as a framework for non-invasive evaluation of buried layers with hard X-rays under grazing incidence.« less

X-ray photoelectron spectroscopy and atomic force microscopy characterization of the effects of etching Zn xCd 1- xTe surfaces

NASA Astrophysics Data System (ADS)

George, M. A.; Azoulay, M.; Jayatirtha, H. N.; Burger, A.; Collins, W. E.; Silberman, E.

1993-10-01

X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) was used for the first time to characterize the chemical composition of modified surfaces of Zn xCd 1- xTe single crystals. These surface treatments were selected for their relevance to device preparation procedures. The XPS peaks indicated an increase of the tellurium and a depletion of the cadmium concentrations upon etching in bromine methanol solution. AFM revealed the formation of pronounced Te inclusions. Higher x values correlated with a decrease in residual bromine left on the surface, while cut and polished samples had higher oxide concentrations and increased bromination of the surface than cleaved samples.

Final Report - X-ray Studies of Highly Correlated Systems

DOE Office of Scientific and Technical Information (OSTI.GOV)

Burns, Clement

2017-11-27

The overall goal of the research was to improve the capabilities of x-ray synchrotron instrumentation to enable cutting-edge research in condensed matter physics. The main goal of the current grant cycle was to find a method to measure the polarization of the scattered x-ray in resonant inelastic x-ray scattering. To do this, we developed a polarization analysis apparatus using a thin, toroidally bent single crystal, which could be set to reflect one or the other of the two polarization components in the scattered x-ray beam. Resonant x-ray scattering measurements were also carried out on interfaces and the charge density wavemore » in high temperature superconducting materials.« less

A Test Stand to Characterize and Contribute to the Development of DEPFET X-ray Detectors

NASA Astrophysics Data System (ADS)

Falcone, Abe

vari-ous modes with variations on the detector settings, (c) characterize the DEPFETs independently of the manufacturer and in modes that are relevant to our x-ray applications, and (d) use this new operation experience and characterization data to inform the next design iterations and the op-timization of DEPFET detectors for future X-ray missions.

Characterization of energy response for photon-counting detectors using x-ray fluorescence

PubMed Central

Ding, Huanjun; Cho, Hyo-Min; Barber, William C.; Iwanczyk, Jan S.; Molloi, Sabee

2014-01-01

Purpose: To investigate the feasibility of characterizing a Si strip photon-counting detector using x-ray fluorescence. Methods: X-ray fluorescence was generated by using a pencil beam from a tungsten anode x-ray tube with 2 mm Al filtration. Spectra were acquired at 90° from the primary beam direction with an energy-resolved photon-counting detector based on an edge illuminated Si strip detector. The distances from the source to target and the target to detector were approximately 19 and 11 cm, respectively. Four different materials, containing silver (Ag), iodine (I), barium (Ba), and gadolinium (Gd), were placed in small plastic containers with a diameter of approximately 0.7 cm for x-ray fluorescence measurements. Linear regression analysis was performed to derive the gain and offset values for the correlation between the measured fluorescence peak center and the known fluorescence energies. The energy resolutions and charge-sharing fractions were also obtained from analytical fittings of the recorded fluorescence spectra. An analytical model, which employed four parameters that can be determined from the fluorescence calibration, was used to estimate the detector response function. Results: Strong fluorescence signals of all four target materials were recorded with the investigated geometry for the Si strip detector. The average gain and offset of all pixels for detector energy calibration were determined to be 6.95 mV/keV and −66.33 mV, respectively. The detector’s energy resolution remained at approximately 2.7 keV for low energies, and increased slightly at 45 keV. The average charge-sharing fraction was estimated to be 36% within the investigated energy range of 20–45 keV. The simulated detector output based on the proposed response function agreed well with the experimental measurement. Conclusions: The performance of a spectral imaging system using energy-resolved photon-counting detectors is very dependent on the energy calibration of the

Ionized absorbers, ionized emitters, and the X-ray spectrum of active galactic nuclei

NASA Technical Reports Server (NTRS)

Netzer, Hagai

1993-01-01

Broad absorption features are common in the X-ray spectrum of low-luminosity AGNs. The features have been modeled by leaky neutral absorbers or by highly ionized gas that completely occult the continuum source. Such models are incomplete since they do not take into account all the physical processes in the gas. In particular, no previous model included the X-ray emission by the ionized absorbing gas and the reflection of the continuum source radiation. The present work discusses the emission, absorption, and reflection properties of photoionized gases with emphasis on conditions thought to prevail in AGNs. It shows that such gas is likely to produce intense X-ray line and continuum radiation and to reflect a sizable fraction of the nonstellar continuum at all energies. If such gas is indeed responsible for the observed X-ray absorption, then absorption edges are much weaker than commonly assumed, and some residual X-ray continuum is likely to be observed even if the line of sight is completely blocked. Moreover, X-ray emission features may show up in sources not showing X-ray absorption. This has immense consequences for medium-resolution X-ray missions, such as BBXRT and Astro-D, and for the planned high-resolution experiments on board XMM and AXAF.

Methods for reducing singly reflected rays on the Wolter-I focusing mirrors of the FOXSI rocket experiment

NASA Astrophysics Data System (ADS)

Buitrago-Casas, Juan Camilo; Elsner, Ronald; Glesener, Lindsay; Christe, Steven; Ramsey, Brian; Courtade, Sasha; Ishikawa, Shin-nosuke; Narukage, Noriyuki; Turin, Paul; Vievering, Juliana; Athiray, P. S.; Musset, Sophie; Krucker, Säm.

2017-08-01

In high energy solar astrophysics, imaging hard X-rays by direct focusing offers higher dynamic range and greater sensitivity compared to past techniques that used indirect imaging. The Focusing Optics X-ray Solar Imager (FOXSI) is a sounding rocket payload that uses seven sets of nested Wolter-I figured mirrors together with seven high-sensitivity semiconductor detectors to observe the Sun in hard X-rays through direct focusing. The FOXSI rocket has successfully flown twice and is funded to fly a third time in summer 2018. The Wolter-I geometry consists of two consecutive mirrors, one paraboloid and one hyperboloid, that reflect photons at grazing angles. Correctly focused X-rays reflect once per mirror segment. For extended sources, like the Sun, off-axis photons at certain incident angles can reflect on only one mirror and still reach the focal plane, generating a background pattern of singly reflected rays (i.e., ghost rays) that can limit the sensitivity of the observation to faint, focused sources. Understanding and mitigating the impact of the singly reflected rays on the FOXSI optical modules will maximize the instruments' sensitivity to background-limited sources. We present an analysis of the FOXSI singly reflected rays based on ray-tracing simulations and laboratory measurements, as well as the effectiveness of different physical strategies to reduce them.

Flat Field Anomalies in an X-ray CCD Camera Measured Using a Manson X-ray Source

DOE Office of Scientific and Technical Information (OSTI.GOV)

M. J. Haugh and M. B. Schneider

2008-10-31

The Static X-ray Imager (SXI) is a diagnostic used at the National Ignition Facility (NIF) to measure the position of the X-rays produced by lasers hitting a gold foil target. The intensity distribution taken by the SXI camera during a NIF shot is used to determine how accurately NIF can aim laser beams. This is critical to proper NIF operation. Imagers are located at the top and the bottom of the NIF target chamber. The CCD chip is an X-ray sensitive silicon sensor, with a large format array (2k x 2k), 24 μm square pixels, and 15 μm thick. Amore » multi-anode Manson X-ray source, operating up to 10kV and 10W, was used to characterize and calibrate the imagers. The output beam is heavily filtered to narrow the spectral beam width, giving a typical resolution E/ΔE≈10. The X-ray beam intensity was measured using an absolute photodiode that has accuracy better than 1% up to the Si K edge and better than 5% at higher energies. The X-ray beam provides full CCD illumination and is flat, within ±1% maximum to minimum. The spectral efficiency was measured at 10 energy bands ranging from 930 eV to 8470 eV. We observed an energy dependent pixel sensitivity variation that showed continuous change over a large portion of the CCD. The maximum sensitivity variation occurred at 8470 eV. The geometric pattern did not change at lower energies, but the maximum contrast decreased and was not observable below 4 keV. We were also able to observe debris, damage, and surface defects on the CCD chip. The Manson source is a powerful tool for characterizing the imaging errors of an X-ray CCD imager. These errors are quite different from those found in a visible CCD imager.« less

Quantitative determination of the lateral density and intermolecular correlation between proteins anchored on the membrane surfaces using grazing incidence small-angle X-ray scattering and grazing incidence X-ray fluorescence.

PubMed

Abuillan, Wasim; Vorobiev, Alexei; Hartel, Andreas; Jones, Nicola G; Engstler, Markus; Tanaka, Motomu

2012-11-28

As a physical model of the surface of cells coated with densely packed, non-crystalline proteins coupled to lipid anchors, we functionalized the surface of phospholipid membranes by coupling of neutravidin to biotinylated lipid anchors. After the characterization of fine structures perpendicular to the plane of membrane using specular X-ray reflectivity, the same membrane was characterized by grazing incidence small angle X-ray scattering (GISAXS). Within the framework of distorted wave Born approximation and two-dimensional Percus-Yevick function, we can analyze the form and structure factors of the non-crystalline, membrane-anchored proteins for the first time. As a new experimental technique to quantify the surface density of proteins on the membrane surface, we utilized grazing incidence X-ray fluorescence (GIXF). Here, the mean intermolecular distance between proteins from the sulfur peak intensities can be calculated by applying Abelé's matrix formalism. The characteristic correlation distance between non-crystalline neutravidin obtained by the GISAXS analysis agrees well with the intermolecular distance calculated by GIXF, suggesting a large potential of the combination of GISAXS and GIXF in probing the lateral density and correlation of non-crystalline proteins displayed on the membrane surface.

X-ray irradiation of yeast cells

NASA Astrophysics Data System (ADS)

Masini, Alessandra; Batani, Dimitri; Previdi, Fabio; Conti, Aldo; Pisani, Francesca; Botto, Cesare; Bortolotto, Fulvia; Torsiello, Flavia; Turcu, I. C. Edmond; Allott, Ric M.; Lisi, Nicola; Milani, Marziale; Costato, Michele; Pozzi, Achille; Koenig, Michel

1997-10-01

Saccharomyces Cerevisiae yeast cells were irradiated using the soft X-ray laser-plasma source at Rutherford Laboratory. The aim was to produce a selective damage of enzyme metabolic activity at the wall and membrane level (responsible for fermentation) without interfering with respiration (taking place in mitochondria) and with nuclear and DNA activity. The source was calibrated by PIN diodes and X-ray spectrometers. Teflon stripes were chosen as targets for the UV laser, emitting X-rays at about 0.9 keV, characterized by a very large decay exponent in biological matter. X-ray doses to the different cell compartments were calculated following a Lambert-Bouguet-Beer law. After irradiation, the selective damage to metabolic activity at the membrane level was measured by monitoring CO2 production with pressure silicon detectors. Preliminary results gave evidence of pressure reduction for irradiated samples and non-linear response to doses. Also metabolic oscillations were evidenced in cell suspensions and it was shown that X-ray irradiation changed the oscillation frequency.

Complete Hard X-Ray Surveys, AGN Luminosity Functions and the X-Ray Background

NASA Technical Reports Server (NTRS)

Tueller, Jack

2011-01-01

AGN are believed to make up most of the Cosmic X-Ray Background (CXB) above a few keV, but this background cannot be fully resolved at energies less than 10 keV due to absorption. The Swift/BAT and INTEGRAL missions are performing the first complete hard x-ray surveys with minimal bias due to absorption. The most recent results for both missions will be presented. Although the fraction of the CXB resolved by these surveys is small, it is possible to derive unbiased number counts and luminosity functions for AGN in the local universe. The survey energy range from 15-150 keV contains the important reflection and cutoff spectral features dominate the shape of the AGN contribution to the CXB. Average spectral characteristics of survey detected AGN will be presented and compared with model distributions. The numbers of hard x-ray blazars detected in these surveys are finally sufficient to estimate this important component's contribution the cosmic background. Constraints on CXB models and their significance will be discussed.

Characterization of short-pulse laser-produced x-rays for diagnosing magnetically driven cylindrical isentropic compression

NASA Astrophysics Data System (ADS)

Sawada, Hiroshi; Daykin, Tyler; Bauer, Bruno; Beg, Farhat

2017-10-01

We have developed an experimental platform to study material properties of magnetically compressed cylinder using a 1 MA pulsed power generator Zebra and a 50 TW subpicosecond short-pulse laser Leopard at the UNR's Nevada Terawatt Facility. According to a MHD simulation, strong magnetic fields generated by 100 ns rise time Zebra current can quasi-isentropically compress a material to the strongly coupled plasma regime. Taking advantage of the cylindrical geometry, a metal rod can be brought to higher pressures than that in the planar geometry. To diagnose the compressed rod with high precision x-ray measurements, an initial laser-only experiment was carried out to characterize laser-produced x-rays. Interaction of a high-intensity, short-pulse laser with solids produces broadband and monochromatic x-rays with photon energies high enough to probe dense metal rods. Bremsstrahlung was measured with Imaging plate-based filter stack spectrometers and monochromatic 8.0 keV Cu K-alpha was recorded with an absolutely calibrated Bragg crystal spectrometer. The broadband x-ray source was applied to radiography of thick metal objects and different filter materials were tested. The experimental results and a design of a coupled experiment will be presented.

VETA x ray data acquisition and control system

NASA Technical Reports Server (NTRS)

Brissenden, Roger J. V.; Jones, Mark T.; Ljungberg, Malin; Nguyen, Dan T.; Roll, John B., Jr.

1992-01-01

We describe the X-ray Data Acquisition and Control System (XDACS) used together with the X-ray Detection System (XDS) to characterize the X-ray image during testing of the AXAF P1/H1 mirror pair at the MSFC X-ray Calibration Facility. A variety of X-ray data were acquired, analyzed and archived during the testing including: mirror alignment, encircled energy, effective area, point spread function, system housekeeping and proportional counter window uniformity data. The system architecture is presented with emphasis placed on key features that include a layered UNIX tool approach, dedicated subsystem controllers, real-time X-window displays, flexibility in combining tools, network connectivity and system extensibility. The VETA test data archive is also described.

Structural studies of the HIV-1 accessory protein Vpu in langmuir monolayers: synchrotron X-ray reflectivity.

PubMed Central

Zheng, S; Strzalka, J; Ma, C; Opella, S J; Ocko, B M; Blasie, J K

2001-01-01

Vpu is an 81 amino acid integral membrane protein encoded by the HIV-1 genome with a N-terminal hydrophobic domain and a C-terminal hydrophilic domain. It enhances the release of virus from the infected cell and triggers degradation of the virus receptor CD4. Langmuir monolayers of mixtures of Vpu and the phospholipid 1,2-dilignoceroyl-sn-glycero-3-phosphocholine (DLgPC) at the water-air interface were studied by synchrotron radiation-based x-ray reflectivity over a range of mole ratios at constant surface pressure and for several surface pressures at a maximal mole ratio of Vpu/DLgPC. Analysis of the x-ray reflectivity data by both slab model-refinement and model-independent box-refinement methods firmly establish the monolayer electron density profiles. The electron density profiles as a function of increasing Vpu/DLgPC mole ratio at a constant, relatively high surface pressure indicated that the amphipathic helices of the cytoplasmic domain lie on the surface of the phospholipid headgroups and the hydrophobic transmembrane helix is oriented approximately normal to the plane of monolayer within the phospholipid hydrocarbon chain layer. At maximal Vpu/DLgPC mole ratio, the tilt of the transmembrane helix with respect to the monolayer normal decreases with increasing surface pressure and the conformation of the cytoplasmic domain varies substantially with surface pressure. PMID:11259297

Calibration of X-Ray Observatories

NASA Technical Reports Server (NTRS)

Weisskopf, Martin C.; L'Dell, Stephen L.

2011-01-01

Accurate calibration of x-ray observatories has proved an elusive goal. Inaccuracies and inconsistencies amongst on-ground measurements, differences between on-ground and in-space performance, in-space performance changes, and the absence of cosmic calibration standards whose physics we truly understand have precluded absolute calibration better than several percent and relative spectral calibration better than a few percent. The philosophy "the model is the calibration" relies upon a complete high-fidelity model of performance and an accurate verification and calibration of this model. As high-resolution x-ray spectroscopy begins to play a more important role in astrophysics, additional issues in accurately calibrating at high spectral resolution become more evident. Here we review the challenges of accurately calibrating the absolute and relative response of x-ray observatories. On-ground x-ray testing by itself is unlikely to achieve a high-accuracy calibration of in-space performance, especially when the performance changes with time. Nonetheless, it remains an essential tool in verifying functionality and in characterizing and verifying the performance model. In the absence of verified cosmic calibration sources, we also discuss the notion of an artificial, in-space x-ray calibration standard. 6th

Kramers-Kronig analysis of soft x-ray reflectivity data of platinum thin film in 40-200 Å wavelength region

DOE Office of Scientific and Technical Information (OSTI.GOV)

Sharma, Saurabh; Department of Applied Physics & Opto-Electronics, Shri Govindram Seksaria Institute of Technology and Science, Indore 452 003; Gupta, R. K.

2016-05-23

Reflectivity beamline at Indus-1 synchrotron source is used to determine optical constants of a platinum thin film in the soft x-ray wavelength region of 40-200Å by applying Kramers-Kronig (KK) technique on R vs wavelength data. Upto 150Å wavelength region the results of KK analysis are found in good agreement with the Henke’s optical constants and also with those obtained by the angle dependent reflectivity technique. A significant mismatch is observed above 150Å wavelength region which could be due to the presence of higher harmonics in the toroidal grating spectra of the reflectivity beamline.

TOPICAL REVIEW: Human soft tissue analysis using x-ray or gamma-ray techniques

NASA Astrophysics Data System (ADS)

Theodorakou, C.; Farquharson, M. J.

2008-06-01

This topical review is intended to describe the x-ray techniques used for human soft tissue analysis. X-ray techniques have been applied to human soft tissue characterization and interesting results have been presented over the last few decades. The motivation behind such studies is to provide improved patient outcome by using the data obtained to better understand a disease process and improve diagnosis. An overview of theoretical background as well as a complete set of references is presented. For each study, a brief summary of the methodology and results is given. The x-ray techniques include x-ray diffraction, x-ray fluorescence, Compton scattering, Compton to coherent scattering ratio and attenuation measurements. The soft tissues that have been classified using x-rays or gamma rays include brain, breast, colon, fat, kidney, liver, lung, muscle, prostate, skin, thyroid and uterus.

Reflected ray retrieval from radio occultation data using radio holographic filtering of wave fields in ray space

NASA Astrophysics Data System (ADS)

Gorbunov, Michael E.; Cardellach, Estel; Lauritsen, Kent B.

2018-03-01

Linear and non-linear representations of wave fields constitute the basis of modern algorithms for analysis of radio occultation (RO) data. Linear representations are implemented by Fourier Integral Operators, which allow for high-resolution retrieval of bending angles. Non-linear representations include Wigner Distribution Function (WDF), which equals the pseudo-density of energy in the ray space. Representations allow for filtering wave fields by suppressing some areas of the ray space and mapping the field back from the transformed space to the initial one. We apply this technique to the retrieval of reflected rays from RO observations. The use of reflected rays may increase the accuracy of the retrieval of the atmospheric refractivity. Reflected rays can be identified by the visual inspection of WDF or spectrogram plots. Numerous examples from COSMIC data indicate that reflections are mostly observed over oceans or snow, in particular over Antarctica. We introduce the reflection index that characterizes the relative intensity of the reflected ray with respect to the direct ray. The index allows for the automatic identification of events with reflections. We use the radio holographic estimate of the errors of the retrieved bending angle profiles of reflected rays. A comparison of indices evaluated for a large base of events including the visual identification of reflections indicated a good agreement with our definition of reflection index.

History of Chandra X-Ray Observatory

NASA Image and Video Library

1997-03-16

This photo shows the High Resolution Camera (HRC) for the Chandra X-Ray Observatory (CXO), formerly Advanced X-Ray Astrophysics Facility (AXAF), being integrated with the High Resolution Mirror Assembly (HRMA) in Marshall Space Flight Center's (MSFC's) 24-foot Vacuum Chamber at the X-Ray Calibration Facility (XRCF). The AXAF was renamed CXO in 1999. The CXO is the most sophisticated and the world's most poweful x-ray telescope ever built. It observes x-rays from high-energy regions of the universe, such as hot gas in the remnants of exploded stars. The HRC is one of the two instruments used at the focus of CXO, where it will detect x-rays reflected from an assembly of eight mirrors. The unique capabilities of the HRC stem from the close match of its imaging capability to the focusing of the mirrors. When used with CXO mirrors, the HRC makes images that reveal detail as small as one-half an arc second. This is equivalent to the ability to read a newspaper at a distance of 1 kilometer. MSFC's XRCF is the world's largest, most advanced laboratory for simulating x-ray emissions from distant celestial objects. It produces a space-like environment in which components relatedto x-ray telescope imaging are tested and the quality of their performances in space is predicted. TRW, Inc. was the prime contractor for the development of the CXO and NASA's MSFC was responsible for its project management. The Smithsonian Astrophysical Observatory controls science and flight operations of the CXO for NASA from Cambridge, Massachusetts. The CXO was launched July 22, 1999 aboard the Space Shuttle Columbia (STS-93).

History of Chandra X-Ray Observatory

NASA Image and Video Library

1997-03-16

This photo shows the High Resolution Camera (HRC) for the Chandra X-Ray Observatory (CXO), formerly Advanced X-Ray Astrophysics Facility (AXAF), being integrated with the High Resolution Mirror Assembly (HRMA) in Marshall Space Flight Center's (MSFC's) 24-foot Vacuum Chamber at the X-Ray Calibration Facility (XRCF). The AXAF was renamed CXO in 1999. The CXO is the most sophisticated and the world's most powerful x-ray telescope ever built. It observes x-rays from high-energy regions of the universe, such as hot gas in the remnants of exploded stars. The HRC is one of the two instruments used at the focus of CXO, where it will detect x-rays reflected from an assembly of eight mirrors. The unique capabilities of the HRC stem from the close match of its imaging capability to the focusing of the mirrors. When used with CXO mirrors, the HRC makes images that reveal detail as small as one-half an arc second. This is equivalent to the ability to read a newspaper at a distance of 1 kilometer. MSFC's XRCF is the world's largest, most advanced laboratory for simulating x-ray emissions from distant celestial objects. It produces a space-like environment in which components related to x-ray telescope imaging are tested and the quality of their performances in space is predicted. TRW, Inc. was the prime contractor for the development of the CXO and NASA's MSFC was responsible for its project management. The Smithsonian Astrophysical Observatory controls science and flight operations of the CXO for NASA from Cambridge, Massachusetts. The CXO was launched July 22, 1999 aboard the Space Shuttle Columbia (STS-93).

Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators

DOE PAGES

Asadchikov, Victor E.; Butashin, Andrey V.; Buzmakov, Alexey V.; ...

2016-03-22

We report on the growth and characterization of several sapphire single crystals for the purpose of x-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique with a dislocation density of 10 2-10 3 cm -2 and a small area with approximately 2*2 mm 2 did not show dislocation contrast in many reflections and has suitable quality for application as a backscattering monochromator. As a result, a clear correlation between growthmore » rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.« less

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

DOE Office of Scientific and Technical Information (OSTI.GOV)

Su P.; Kaznatcheev K.; Wang, Y.

In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure surface slope errors with precision and accuracy better than 100 nrad (rms) and {approx}200 nrad (rms), respectively, with a lateral resolution of few mm or less. We present results of the calibration of the metrology systems, discuss their accuracy and address the precision in measuring amore » spherical mirror.« less

Total reflection X-ray fluorescence analysis of airborne silver nanoparticles from fabrics.

PubMed

Menzel, Magnus; Fittschen, Ursula Elisabeth Adriane

2014-03-18

Ag nanoparticles (NPs) are usually applied to consumer products because of their antimicrobial properties, which are desired in fabrics for sportswear as well as cloth used for cleaning. Hazards to human health from airborne Ag NPs may occur when the NPs are inhaled. NPs are comparable in size to macromolecules and viruses and able to penetrate deep into the lungs, e.g., the alveoli, where they may cause damage to cells and tissue due to their large surface area. In this study, aerosols released form fabrics treated with Ag NPs were collected using a low pressure Berner impactor and analyzed with total reflection X-ray fluorescence (TXRF). We found that the Ag NPs are released primarily in the form of larger particles, mainly 0.13-2 μm, probably attached to fiber material. Using an electron micro probe, single particles could be identified. The detection of backscattered electrons suggests small spots on the particle consist of a heavier element, which most likely is Ag, although the signal in energy-dispersive X-ray spectroscopy (EDX) was below the lower limit of detection (LOD). To achieve LODs necessary for Ag determination, Ar peaks were eliminated by a nitrogen atmosphere provided by the "Picofox-box". This enables linear calibration and quantification of Ag. The LOD was calculated at 0.2 ng (2.0 ppb). Following the TXRF and scanning electron microscopy (SEM)/EDX analysis, the aerosol samples were dissolved in nitric acid and analyzed with ICPMS to successfully confirm the results obtained by the TXRF measurements.

Characterizing Hohlraum Plasma Conditions at the National Ignition Facility (NIF) Using X-ray Spectroscopy

NASA Astrophysics Data System (ADS)

Barrios, Maria Alejandra

2015-11-01

Improved hohlraums will have a significant impact on increasing the likelihood of indirect drive ignition at the NIF. In indirect-drive Inertial Confinement Fusion (ICF), a high-Z hohlraum converts laser power into a tailored x-ray flux that drives the implosion of a spherical capsule filled with D-T fuel. The x-radiation drive to capsule coupling sets the velocity, adiabat, and symmetry of the implosion. Previous experiments in gas-filled hohlraums determined that the laser-hohlraum energy coupling is 20-25% less than modeled, therefore identifying energy loss mechanisms that reduce the efficacy of the hohlraum drive is central to improving implosion performance. Characterizing the plasma conditions, particularly the plasma electron temperature (Te) , is critical to understanding mechanism that affect the energy coupling such as the laser plasma interactions (LPI), hohlraum x-ray conversion efficiency, and dynamic drive symmetry. The first Te measurements inside a NIF hohlraum, presented here, were achieved using K-shell X-ray spectroscopy of an Mn-Co tracer dot. The dot is deposited on a thin-walled CH capsule, centered on the hohlraum symmetry axis below the laser entrance hole (LEH) of a bottom-truncated hohlraum. The hohlraum x-ray drive ablates the dot and causes it to flow upward, towards the LEH, entering the hot laser deposition region. An absolutely calibrated streaked spectrometer with a line of sight into the LEH records the temporal history of the Mn and Co X-ray emission. The measured (interstage) Lyα/ Heα line ratios for Co and Mn and the Mn-Heα/Co-Heα isoelectronic line ratio are used to infer the local plasma Te from the atomic physics code SCRAM. Time resovled x-ray images perpendicular to the hohlraum axis record the dot expansion and trajectory into the LEH region. The temporal evolution of the measured Te and dot trajectory are compared with simulations from radiation-hydrodynamic codes. This work was performed under the auspices of the U

Hard state neutron star and black hole X-ray binaries in the radio:X-ray luminosity plane

NASA Astrophysics Data System (ADS)

Gallo, Elena; Degenaar, Nathalie; van den Eijnden, Jakob

2018-07-01

Motivated by the large body of literature around the phenomenological properties of accreting black hole (BH) and neutron star (NS) X-ray binaries in the radio:X-ray luminosity plane, we carry out a comparative regression analysis on 36 BHs and 41 NSs in hard X-ray states, with data over 7 dex in X-ray luminosity for both. The BHs follow a radio to X-ray (logarithmic) luminosity relation with slope β = 0.59 ± 0.02, consistent with the NSs' slope (β =0.44^{+0.05}_{-0.04}) within 2.5σ. The best-fitting intercept for the BHs significantly exceeds that for the NSs, cementing BHs as more radio loud, by a factor ˜22. This discrepancy cannot be fully accounted for by the mass or bolometric correction gap, or by the NS boundary layer contribution to the X-rays, and is likely to reflect physical differences in the accretion flow efficiency, or the jet powering mechanism. Once importance sampling is implemented to account for the different luminosity distributions, the slopes of the non-pulsating and pulsating NS subsamples are formally inconsistent (>3σ), unless the transitional millisecond pulsars (whose incoherent radio emission mechanism is not firmly established) are excluded from the analysis. We confirm the lack of a robust partitioning of the BH data set into separate luminosity tracks.

Hard state neutron star and black hole X-ray binaries in the radio:X-ray luminosity plane

NASA Astrophysics Data System (ADS)

Gallo, Elena; Degenaar, Nathalie; van den Eijnden, Jakob

2018-05-01

Motivated by the large body of literature around the phenomenological properties of accreting black hole (BH) and neutron star (NS) X-ray binaries in the radio:X-ray luminosity plane, we carry out a comparative regression analysis on 36 BHs and 41 NSs in hard X-ray states, with data over 7 dex in X-ray luminosity for both. The BHs follow a radio to X-ray (logarithmic) luminosity relation with slope β = 0.59 ± 0.02, consistent with the NSs' slope (β =0.44^{+0.05}_{-0.04}) within 2.5σ. The best-fitting intercept for the BHs significantly exceeds that for the NSs, cementing BHs as more radio loud, by a factor ˜22. This discrepancy can not be fully accounted for by the mass or bolometric correction gap, nor by the NS boundary layer contribution to the X-rays, and is likely to reflect physical differences in the accretion flow efficiency, or the jet powering mechanism. Once importance sampling is implemented to account for the different luminosity distributions, the slopes of the non-pulsating and pulsating NS subsamples are formally inconsistent (>3σ), unless the transitional millisecond pulsars (whose incoherent radio emission mechanism is not firmly established) are excluded from the analysis. We confirm the lack of a robust partitioning of the BH data set into separate luminosity tracks.

Total-reflection X-ray fluorescence studies of trace elements in biomedical samples

NASA Astrophysics Data System (ADS)

Kubala-Kukuś, A.; Braziewicz, J.; Pajek, M.

2004-08-01

Application of the total-reflection X-ray fluorescence (TXRF) analysis in the studies of trace element contents in biomedical samples is discussed in the following aspects: (i) a nature of trace element concentration distributions, (ii) censoring approach to the detection limits, and (iii) a comparison of two sets of censored data. The paper summarizes the recent results achieved in this topics, in particular, the lognormal, or more general logstable, nature of concentration distribution of trace elements, the random left-censoring and the Kaplan-Meier approach accounting for detection limits and, finally, the application of the logrank test to compare the censored concentrations measured for two groups. These new aspects, which are of importance for applications of the TXRF in different fields, are discussed here in the context of TXRF studies of trace element in various samples of medical interest.

Determination of trace metals in spirits by total reflection X-ray fluorescence spectrometry

NASA Astrophysics Data System (ADS)

Siviero, G.; Cinosi, A.; Monticelli, D.; Seralessandri, L.

2018-06-01

Eight spirituous samples were analyzed for trace metal content with Horizon Total Reflection X-Ray Fluorescence (TXRF) Spectrometer. The expected single metal amount is at the ng/g level in a mixed aqueous/organic matrix, thus requiring a sample preparation method capable of achieving suitable limits of detection. On-site enrichment and Atmospheric Pressure-Vapor Phase Decomposition allowed to detect Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Sr and Pb with detection limits ranging from 0.1 ng/g to 4.6 ng/g. These results highlight how the synergy between instrument and sample preparation strategy may foster the use of TXRF as a fast and reliable technique for the determination of trace elements in spirituous samples, either for quality control or risk assessment purposes.

Design and development of the SIMBOL-X hard x-ray optics

NASA Astrophysics Data System (ADS)

Pareschi, G.; Attinà, P.; Basso, S.; Borghi, G.; Burkert, W.; Buzzi, R.; Citterio, O.; Civitani, M.; Conconi, P.; Cotroneo, V.; Cusumano, G.; Dell'Orto, E.; Freyberg, M.; Hartner, G. D.; Gorenstein, P.; Mattaini, E.; Mazzoleni, F.; Parodi, G.; Romaine, S.; Spiga, D.; Tagliaferri, G.; Valtolina, R.; Valsecchi, G.; Vernani, D.

2008-07-01

The SIMBOL-X formation-flight X-ray mission will be operated by ASI and CNES in 2014, with a large participation of the French and Italian high energy astrophysics scientific community. Also German and US Institutions are contributing in the implementation of the scientific payload. Thanks to the formation-flight architecture, it will be possible to operate a long (20 m) focal length grazing incidence mirror module, formed by 100 confocal multilayer-coated Wolter I shells. This system will allow us to focus X-rays over a very broad energy band, from 0.5 keV up to 80 keV and beyond, with more than two orders of magnitude improvement in angular resolution (20 arcsec HEW) and sensitivity (0.5 µCrab on axis @30 keV) compared to non focusing detectors used so far. The X-ray mirrors will be realized by Ni electroforming replication, already successfully used for BeppoSAX, XMM-Newton, and JET-X/SWIFT; the thickness trend will be about two times less than for XMM, in order to save mass. Multilayer reflecting coatings will be implemented, in order to improve the reflectivity beyond 10 keV and to increase the field of view 812 arcmin at 30 keV). In this paper, the SIMBOL-X optics design, technology and implementation challenges will be discussed; it will be also reported on recent results obtained in the context of the SIMBOL-X optics development activities.

X-Ray Testing Constellation-X Optics at MSFC's 100-m Facility

NASA Technical Reports Server (NTRS)

O'Dell, Stephen; Baker, Markus; Content, David; Freeman, Mark; Glenn, Paul; Gubarev, Mikhail; Hair, Jason; Jones, William; Joy, Marshall

2003-01-01

In addition to the 530-m-long X-Ray Calibration Facility (XRCF), NASA's Marshall Space Flight Center (MSFC) operates a 104-m-long (source-to-detector) X-ray-test facility. Originally developed and still occasionally used for stray-light testing of visible-fight optical systems, the so-called "Stray-Light Facility" now serves primarily as a convenient and inexpensive facility for performance evaluation and calibration of X-ray optics and detectors. The facility can accommodate X-ray optics up to about 1-m diameter and 12-m focal length. Currently available electron-impact sources at the facility span the approximate energy range 0.2 to 100 keV, thus supporting testing of soft- and hard-X-ray optics and detectors. Available MSFC detectors are a front-illuminated CCD (charge-coupled device) and a scanning CZT (cadmium--zinc--telluride) detector, with low-energy cut-offs of about 0.8 and 3 keV, respectively. In order to test developmental optics for the Constellation-X Project, led by NASA's Goddard Space Flight Center (GSFC), MSFC undertook several enhancements to the facility. Foremost among these was development and fabrication of a five-degree-of-freedom (5-DoF) optics mount and control system, which translates and tilts the user-provided mirror assembly suspended from its interface plate. Initial Constellation-X tests characterize the performance of the Optical Alignment Pathfinder Two (OAP2) for the large Spectroscopy X-ray Telescope (SXT) and of demonstration mirror assemblies for the Hard X-ray Telescope (HXT). With the Centroid Detector Assembly (CDA), used for precision alignment of the Chandra (nee AXAF) mirrors, the Constellation-X SXT Team optically aligned the individual mirrors of the OAPZ at GSFC. The team then developed set-up and alignment procedures, including transfer of the alignment from the optical alignment facility at GSFC to the X-ray test facility at MSFC, using a reference flat and fiducials. The OAPZ incorporates additional ancillary

A novel vacuum spectrometer for total reflection x-ray fluorescence analysis with two exchangeable low power x-ray sources for the analysis of low, medium, and high Z elements in sequence

NASA Astrophysics Data System (ADS)

Wobrauschek, P.; Prost, J.; Ingerle, D.; Kregsamer, P.; Misra, N. L.; Streli, C.

2015-08-01

The extension of the detectable elemental range with Total Reflection X-ray Fluorescence (TXRF) analysis is a challenging task. In this paper, it is demonstrated how a TXRF spectrometer is modified to analyze elements from carbon to uranium. Based on the existing design of a vacuum TXRF spectrometer with a 12 specimen sample changer, the following components were renewed: the silicon drift detector with 20 mm2 active area and having a special ultra-thin polymer window allowing the detection of elements from carbon upwards. Two exchangeable X-ray sources guarantee the efficient excitation of both low and high Z elements. These X-ray sources were two light-weighted easily mountable 35 W air-cooled low-power tubes with Cr and Rh anodes, respectively. The air cooled tubes and the Peltier-cooled detector allowed to construct a transportable tabletop spectrometer with compact dimensions, as neither liquid nitrogen cooling for the detector nor a water cooling circuit and a bulky high voltage generator for the X-ray tubes are required. Due to the excellent background conditions as a result of the TXRF geometry, detection limits of 150 ng for C, 12 ng for F, and 3.3 ng for Na have been obtained using Cr excitation in vacuum. For Rh excitation, the detection limits of 90 pg could be achieved for Sr. Taking 10 to 20 μl of sample volume, extrapolated detection limits in the ng/g (ppb) range are resulting in terms of concentration.

X-Ray Optics for the 2020's

NASA Technical Reports Server (NTRS)

Zhang, Will

2010-01-01

X-ray optics is an essential and enabling technology for x-ray astronomy. This slide presentation presents the authors views on the requirements for x-ray optics as progress is made toward building IXO and preparing for the 2020's. The presentation reviews the status of several technologies that are being developed and outlines the steps that we as a community needs to take to move toward x-ray optics meeting the five key requirements: (1) high angular resolution, (2) large effective area, (3) low mass, (4) fast production, and (5) low cost. There is discussion of segmentation vs full shell, size of the mirror segment, mirror segment frabrication, post-slumping figure improvement, and characterization of coating quality.

Measuring the Dust Grains and Distance to X Persei Via Its X-ray Halo

NASA Astrophysics Data System (ADS)

Smith, Randall

2006-09-01

We propose to observe the X-ray halo of the high mass X-ray binary pulsar X Per to measure interstellar dust grains along the line of sight (LOS) and to determine the distance to X Per. The X-ray halo is formed by scattering from grains along the LOS, which for X Per appear to be concentrated in one molecular cloud. Unlike many other X-ray halo observations, this low-absorption high-latitude sightline is well-characterized from absorption spectroscopy done with HST, Copernicus, and FUSE. This halo observation will measure the distance to the cloud and the dust size distribution in it. We will also be able to determine the distance to X Per by measuring the time delayed pulses in the X-ray halo.

X-Rays

MedlinePlus

X-rays are a type of radiation called electromagnetic waves. X-ray imaging creates pictures of the inside of ... different amounts of radiation. Calcium in bones absorbs x-rays the most, so bones look white. Fat ...

An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications.

PubMed

Karydas, Andreas Germanos; Czyzycki, Mateusz; Leani, Juan José; Migliori, Alessandro; Osan, Janos; Bogovac, Mladen; Wrobel, Pawel; Vakula, Nikita; Padilla-Alvarez, Roman; Menk, Ralf Hendrik; Gol, Maryam Ghahremani; Antonelli, Matias; Tiwari, Manoj K; Caliri, Claudia; Vogel-Mikuš, Katarina; Darby, Iain; Kaiser, Ralf Bernd

2018-01-01

The International Atomic Energy Agency (IAEA) jointly with the Elettra Sincrotrone Trieste (EST) operates a multipurpose X-ray spectrometry endstation at the X-ray Fluorescence beamline (10.1L). The facility has been available to external users since the beginning of 2015 through the peer-review process of EST. Using this collaboration framework, the IAEA supports and promotes synchrotron-radiation-based research and training activities for various research groups from the IAEA Member States, especially those who have limited previous experience and resources to access a synchrotron radiation facility. This paper aims to provide a broad overview about various analytical capabilities, intrinsic features and performance figures of the IAEA X-ray spectrometry endstation through the measured results. The IAEA-EST endstation works with monochromatic X-rays in the energy range 3.7-14 keV for the Elettra storage ring operating at 2.0 or 2.4 GeV electron energy. It offers a combination of different advanced analytical probes, e.g. X-ray reflectivity, X-ray absorption fine-structure measurements, grazing-incidence X-ray fluorescence measurements, using different excitation and detection geometries, and thereby supports a comprehensive characterization for different kinds of nanostructured and bulk materials.

X-ray characterization of curved crystals for hard x-ray astronomy

NASA Astrophysics Data System (ADS)

Buffagni, Elisa; Bonnini, Elisa; Ferrari, Claudio; Virgilli, Enrico; Frontera, Filippo

2015-05-01

Among the methods to focus photons the diffraction in crystals results as one of the most effective for high energy photons. An assembling of properly oriented crystals can form a lens able to focus x-rays at high energy via Laue diffraction in transmission geometry; this is a Laue lens. The x-ray diffraction theory provides that the maximum diffraction efficiency is achieved in ideal mosaic crystals, but real mosaic crystals show diffraction efficiencies several times lower than the ideal case due to technological problems. An alternative and convenient approach is the use of curved crystals. We have recently optimized an efficient method based on the surface damage of crystals to produce self-standing uniformly curved Si, GaAs and Ge tiles of thickness up to 2-3 mm and curvature radii R down to a few meters. We show that, for curved diffracting planes, such crystals have a diffraction efficiency nearly forty times higher than the diffraction efficiency of perfect similar flat crystals, thus very close to that of ideal mosaic crystals. Moreover, in an alternative configuration where the diffracting planes are perpendicular to the curved ones, a focusing effect occurs and will be shown. These results were obtained for several energies between 17 and 120 keV with lab sources or at high energy facilities such as LARIX at Ferrara (Italy), ESRF at Grenoble (France), and ANKA at Karlsruhe (Germany).

X-Ray Properties of Lensing-Selected Clusters

NASA Astrophysics Data System (ADS)

Paterno-Mahler, Rachel; Sharon, Keren; Bayliss, Matthew; McDonald, Michael; Gladders, Michael; Johnson, Traci; Dahle, Hakon; Rigby, Jane R.; Whitaker, Katherine E.; Florian, Michael; Wuyts, Eva

2017-08-01

I will present preliminary results from the Michigan Swift X-ray observations of clusters from the Sloan Giant Arcs Survey (SGAS). These clusters were lensing selected based on the presence of a giant arc visible from SDSS. I will characterize the morphology of the intracluster medium (ICM) of the clusters in the sample, and discuss the offset between the X-ray centroid, the mass centroid as determined by strong lensing analysis, and the BCG position. I will also present early-stage work on the scaling relation between the lensing mass and the X-ray luminosity.

High Resolution X-Ray Spectroscopy of zeta Puppis with the XMM-Newton Reflection Grating Spectrometer

NASA Technical Reports Server (NTRS)

Kahn, S. M.; Leutenegger, M. A.; Cottam, J.; Rauw, G.; Vreux, J.-M.; denBoggende, A. J. F.; Mewe, R.; Guedel, M.

2000-01-01

We present the first high resolution X-ray spectrum of the bright O4Ief supergiant star Puppis, obtained with the Reflection Grating Spectrometer on- board XMM-Newton. The spectrum exhibits bright emission lines of hydrogen-like and helium-like ions of nitrogen, oxygen, neon, magnesium, and silicon, as well as neon-like ions of iron. The lines are all significantly resolved, with characteristic velocity widths of order 1000 - 1500 km/ s. The nitrogen lines are especially strong, and indicate that the shocked gas in the wind is mixed with CNO-burned material, as has been previously inferred for the atmosphere of this star from ultraviolet spectra. We find that the forbidden to intercombination line ratios within the helium-like triplets are anomalously low for N VI, O VII, and Ne IX. While this is sometimes indicative of high electron density, we show that in this case, it is instead caused by the intense ultraviolet radiation field of the star. We use this interpretation to derive constraints on the location of the X-ray emitting shocks within the wind that agree remarkably well with current theoretical models for this system.

Pulsed x-ray sources for characterization of gated framing cameras

NASA Astrophysics Data System (ADS)

Filip, Catalin V.; Koch, Jeffrey A.; Freeman, Richard R.; King, James A.

2017-08-01

Gated X-ray framing cameras are used to measure important characteristics of inertial confinement fusion (ICF) implosions such as size and symmetry, with 50 ps time resolution in two dimensions. A pulsed source of hard (>8 keV) X-rays, would be a valuable calibration device, for example for gain-droop measurements of the variation in sensitivity of the gated strips. We have explored the requirements for such a source and a variety of options that could meet these requirements. We find that a small-size dense plasma focus machine could be a practical single-shot X-ray source for this application if timing uncertainties can be overcome.

Fabrication of imaging X-ray optics

NASA Astrophysics Data System (ADS)

Catura, R. C.; Joki, E. G.; Brookover, W. J.

The design, fabrication, and performance of optics for X-ray astronomy and laboratory applications are described and illustrated with diagrams, drawings, graphs, photographs, and sample images. Particular attention is given to the Wolter I telescope developed for spectroscopic observation of 8-30-A cosmic X-ray sources from a rocketborne X-ray Objective Grating Spectrometer; this instrument employs three nested paraboloid-hyperboloid mirrors of 5083 Al alloy, figured by diamond turning and covered with a thin coating of acrylic lacquer prior to deposition of a 40-nm-thick layer of Sn. In calibration tests at NASA Marshall, the FWHM of the line-spread function at 1.33 nm was found to be 240 microns, corresponding to 21 arcsec. Also presented are the results of reflectivity measurements on C and W multilayers sputtered on Si and fusion glass substrates.

Higher-harmonics suppressor for soft x rays

DOE Office of Scientific and Technical Information (OSTI.GOV)

Waki, I.; Hirai, Y.; Momose, A.

We have developed an apparatus for suppressing higher harmonics contained in the soft x-ray output beam of grazing-incidence grating monochromators. It consists of eight pairs of total-reflection mirrors. Each pair serves as a low-pass filter with the cutoff energy different from one another. The eight pairs are designed to cover an energy range of 80--1600 eV with an efficiency of harmonic suppression better than 97%, while transmitting more than 50% of the fundamental photons. We have tested its preliminary performance on the soft x-ray beamline BL-8A at the Photon Factory. We present the observed transmission efficiencies and the effects ofmore » the harmonic suppressor on measurements of reflectivity and fluorescence spectra.« less

The Water Recovery X-ray Rocket (WRX-R)

NASA Astrophysics Data System (ADS)

Miles, Drew

2017-08-01

The Water Recovery X-ray Rocket (WRX-R) is a diffuse soft X-ray spectrometer that will launch on a sounding rocket from the Kwajalein Atoll. WRX-R has a field of view of >10 deg2 and will observe the Vela supernova remnant. A mechanical collimator, state-of-the-art off-plane reflection grating array and hybrid CMOS detector will allow WRX to achieve the most highly-resolved spectrum of the Vela SNR ever recorded. In addition, this payload will fly a hard X-ray telescope that is offset from the soft X-ray spectrometer in order to observe the pulsar at the center of the remnant. We present here an introduction to the instrument, the expected science return, and an update on the state of the payload as we work towards launch.

Electron-positron pairs, Compton reflection, and the X-ray spectra of active galactic nuclei

NASA Technical Reports Server (NTRS)

Zdziarski, Andrzej A.; Ghisellini, Gabriele; George, Ian M.; Fabian, A. C.; Svensson, Roland; Done, Chris

1990-01-01

It is shown here that reprocessing of radiation fron nonthermal pair cascades by cold material in the central parts of active galactic nuclei (AGN) gives rise to X-ray and gamma-ray spectra that satisfy current observational constraints. An average 1-30 keV X-ray spectral index alpha(x) of about 0.7 in the compact range 30-300 is obtained for a wide range of Lorentz factors of the injected electrons. The gamma-ray spectra are steep, with alpha(gamma) about two, and satisfy the observational constraints. Radiation from pair cascades exhibits steep power law decreases in soft X-rays similar to those observed in AGN. The overall picture is consistent with AGN having an accretion disk which intercepts and reprocesses a substantial fraction of the nonthermal continuum incident upon it from above and below.

A Compact X-Ray System for Macromolecular Crystallography. 5

NASA Technical Reports Server (NTRS)

Gubarev, Mikhail; Ciszak, Ewa; Ponomarev, Igor; Joy, Marshall

2000-01-01

We describe the design and performance of a high flux x-ray system for macromolecular crystallography that combines a microfocus x-ray generator (40 gm FWHM spot size at a power level of 46.5Watts) and a 5.5 mm focal distance polycapillary optic. The Cu K(sub alpha) X-ray flux produced by this optimized system is 7.0 times above the X-ray flux previously reported. The X-ray flux from the microfocus system is also 3.2 times higher than that produced by the rotating anode generator equipped with a long focal distance graded multilayer monochromator (Green optic; CMF24-48-Cu6) and 30% less than that produced by the rotating anode generator with the newest design of graded multilayer monochromator (Blue optic; CMF12-38-Cu6). Both rotating anode generators operate at a power level of 5000 Watts, dissipating more than 100 times the power of our microfocus x-ray system. Diffraction data collected from small test crystals are of high quality. For example, 42,540 reflections collected at ambient temperature from a lysozyme crystal yielded R(sub sym) 5.0% for the data extending to 1.7A, and 4.8% for the complete set of data to 1.85A. The amplitudes of the reflections were used to calculate difference electron density maps that revealed positions of structurally important ions and water molecules in the crystal of lysozyme using the phases calculated from the protein model.

Breakthroughs in photonics 2013: X-ray optics

DOE PAGES

Soufli, Regina

2014-04-01

Here, this review discusses the latest advances in extreme ultraviolet/X-ray optics development, which are motivated by the availability and demands of new X-ray sources and scientific and industrial applications. Among the breakthroughs highlighted are the following: i) fabrication, metrology, and mounting technologies for large-area optical substrates with improved figure, roughness, and focusing properties; ii) multilayer coatings with especially optimized layer properties, achieving improved reflectance, stability, and out-of-band suppression; and iii) nanodiffractive optics with improved efficiency and resolution.

Growth, characterization and estimation of lattice strain and size in CdS nanoparticles: X-ray peak profile analysis

NASA Astrophysics Data System (ADS)

Solanki, Rekha Garg; Rajaram, Poolla; Bajpai, P. K.

2018-05-01

This work is based on the growth, characterization and estimation of lattice strain and crystallite size in CdS nanoparticles by X-ray peak profile analysis. The CdS nanoparticles were synthesized by a non-aqueous solvothermal method and were characterized by powder X-ray diffraction (XRD), transmission electron microscopy (TEM), Raman and UV-visible spectroscopy. XRD confirms that the CdS nanoparticles have the hexagonal structure. The Williamson-Hall (W-H) method was used to study the X-ray peak profile analysis. The strain-size plot (SSP) was used to study the individual contributions of crystallite size and lattice strain from the X-rays peaks. The physical parameters such as strain, stress and energy density values were calculated using various models namely, isotropic strain model, anisotropic strain model and uniform deformation energy density model. The particle size was estimated from the TEM images to be in the range of 20-40 nm. The Raman spectrum shows the characteristic optical 1LO and 2LO vibrational modes of CdS. UV-visible absorption studies show that the band gap of the CdS nanoparticles is 2.48 eV. The results show that the crystallite size estimated from Scherrer's formula, W-H plots, SSP and the particle size calculated by TEM images are approximately similar.

Can the cosmic x ray and gamma ray background be due to reflection of a steep power law spectrum and Compton scattering by relativistic electrons?

NASA Technical Reports Server (NTRS)

Zycki, Piotr T.; Zdziarski, Andrzej A.; Svensson, Roland

1991-01-01

We reconsider the recent model for the origin in the cosmic X-ray and gamma-ray background by Rogers and Field. The background in the model is due to an unresolved population of AGNs. An individual AGN spectrum contains three components: a power law with the energy index of alpha = 1.1, an enhanced reflection component, and a component from Compton scattering by relativistic electrons with a low energy cutoff at some minimum Lorentz factor, gamma(sub min) much greater than 1. The MeV bump seen in the gamma-ray background is then explained by inverse Compton emission by the electrons. We show that the model does not reproduce the shape of the observed X-ray and gamma-ray background below 10 MeV and that it overproduces the background at larger energies. Furthermore, we find the assumptions made for the Compton component to be physically inconsistent. Relaxing the inconsistent assumptions leads to model spectra even more different from that of the observed cosmic background. Thus, we can reject the hypothesis that the high-energy cosmic background is due to the described model.

Large area CMOS active pixel sensor x-ray imager for digital breast tomosynthesis: Analysis, modeling, and characterization.

PubMed

Zhao, Chumin; Kanicki, Jerzy; Konstantinidis, Anastasios C; Patel, Tushita

2015-11-01

Large area x-ray imagers based on complementary metal-oxide-semiconductor (CMOS) active pixel sensor (APS) technology have been proposed for various medical imaging applications including digital breast tomosynthesis (DBT). The low electronic noise (50-300 e-) of CMOS APS x-ray imagers provides a possible route to shrink the pixel pitch to smaller than 75 μm for microcalcification detection and possible reduction of the DBT mean glandular dose (MGD). In this study, imaging performance of a large area (29×23 cm2) CMOS APS x-ray imager [Dexela 2923 MAM (PerkinElmer, London)] with a pixel pitch of 75 μm was characterized and modeled. The authors developed a cascaded system model for CMOS APS x-ray imagers using both a broadband x-ray radiation and monochromatic synchrotron radiation. The experimental data including modulation transfer function, noise power spectrum, and detective quantum efficiency (DQE) were theoretically described using the proposed cascaded system model with satisfactory consistency to experimental results. Both high full well and low full well (LFW) modes of the Dexela 2923 MAM CMOS APS x-ray imager were characterized and modeled. The cascaded system analysis results were further used to extract the contrast-to-noise ratio (CNR) for microcalcifications with sizes of 165-400 μm at various MGDs. The impact of electronic noise on CNR was also evaluated. The LFW mode shows better DQE at low air kerma (Ka<10 μGy) and should be used for DBT. At current DBT applications, air kerma (Ka∼10 μGy, broadband radiation of 28 kVp), DQE of more than 0.7 and ∼0.3 was achieved using the LFW mode at spatial frequency of 0.5 line pairs per millimeter (lp/mm) and Nyquist frequency ∼6.7 lp/mm, respectively. It is shown that microcalcifications of 165-400 μm in size can be resolved using a MGD range of 0.3-1 mGy, respectively. In comparison to a General Electric GEN2 prototype DBT system (at MGD of 2.5 mGy), an increased CNR (by ∼10) for

Quantitative Measurements of X-ray Intensity

DOE Office of Scientific and Technical Information (OSTI.GOV)

Haugh, M. J., Schneider, M.

This chapter describes the characterization of several X-ray sources and their use in calibrating different types of X-ray cameras at National Security Technologies, LLC (NSTec). The cameras are employed in experimental plasma studies at Lawrence Livermore National Laboratory (LLNL), including the National Ignition Facility (NIF). The sources provide X-rays in the energy range from several hundred eV to 110 keV. The key to this effort is measuring the X-ray beam intensity accurately and traceable to international standards. This is accomplished using photodiodes of several types that are calibrated using radioactive sources and a synchrotron source using methods and materials thatmore » are traceable to the U.S. National Institute of Standards and Technology (NIST). The accreditation procedures are described. The chapter begins with an introduction to the fundamental concepts of X-ray physics. The types of X-ray sources that are used for device calibration are described. The next section describes the photodiode types that are used for measuring X-ray intensity: power measuring photodiodes, energy dispersive photodiodes, and cameras comprising photodiodes as pixel elements. Following their description, the methods used to calibrate the primary detectors, the power measuring photodiodes and the energy dispersive photodiodes, as well as the method used to get traceability to international standards are described. The X-ray source beams can then be measured using the primary detectors. The final section then describes the use of the calibrated X-ray beams to calibrate X-ray cameras. Many of the references are web sites that provide databases, explanations of the data and how it was generated, and data calculations for specific cases. Several general reference books related to the major topics are included. Papers expanding some subjects are cited.« less

Flat field anomalies in an x-ray charge coupled device camera measured using a Manson x-ray source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Haugh, M. J.; Schneider, M. B.

2008-10-15

The static x-ray imager (SXI) is a diagnostic used at the National Ignition Facility (NIF) to measure the position of the x rays produced by lasers hitting a gold foil target. The intensity distribution taken by the SXI camera during a NIF shot is used to determine how accurately NIF can aim laser beams. This is critical to proper NIF operation. Imagers are located at the top and the bottom of the NIF target chamber. The charge coupled device (CCD) chip is an x-ray sensitive silicon sensor, with a large format array (2kx2k), 24 {mu}m square pixels, and 15 {mu}mmore » thick. A multianode Manson x-ray source, operating up to 10 kV and 10 W, was used to characterize and calibrate the imagers. The output beam is heavily filtered to narrow the spectral beam width, giving a typical resolution E/{delta}E{approx_equal}10. The x-ray beam intensity was measured using an x-ray photodiode that has an accuracy better than 1% up to the Si K edge and better than 5% at higher energies. The x-ray beam provides full CCD illumination and is flat, within {+-}1% maximum to minimum. The spectral efficiency was measured at ten energy bands ranging from 930 to 8470 eV. We observed an energy dependent pixel sensitivity variation that showed continuous change over a large portion of the CCD. The maximum sensitivity variation occurred at 8470 eV. The geometric pattern did not change at lower energies, but the maximum contrast decreased and was not observable below 4 keV. We were also able to observe debris, damage, and surface defects on the CCD chip. The Manson source is a powerful tool for characterizing the imaging errors of an x-ray CCD imager. These errors are quite different from those found in a visible CCD imager.« less

Examination of U valence states in the brannerite structure by near-infrared diffuse reflectance and X-ray photoelectron spectroscopies

NASA Astrophysics Data System (ADS)

Finnie, Kim S.; Zhang, Zhaoming; Vance, Eric R.; Carter, Melody L.

2003-04-01

The valence state of uranium doped into a f 0 thorium analog of brannerite (i.e., thorutite) has been examined using near-infrared (NIR) diffuse reflectance (DRS) and X-ray photoelectron (XPS) spectroscopies. NIR transitions of U 4+, which are not observed in spectra of brannerite, have been detected in the samples of U xTh 1- xTi 2O 6, and we propose that strong specular reflectance is responsible for the lack of U 4+ features in UTi 2O 6. Characteristic U 5+ bands have been identified in samples in which sufficient Ca 2+ has been added to nominally effect complete oxidation to U 5+. XPS results support the assignments of U 4+ and U 5+ by DRS. The presence of residual U 4+ bands in the spectra of the Ca-doped samples is consistent with segregation of Ca 2+ to the grain boundaries during high temperature sintering.

A Compact X-Ray System for Macromolecular Crystallography

NASA Technical Reports Server (NTRS)

Gubarev, Mikhail; Ciszak, Ewa; Ponomarev, Igor; Gibson, Walter; Joy, Marshall

2000-01-01

We describe the design and performance of a high flux x-ray system for a macromolecular crystallography that combines a microfocus x-ray generator (40 micrometer full width at half maximum spot size at a power level of 46.5 W) and a collimating polycapillary optic. The Cu Ka lpha x-ray flux produced by this optimized system through a 500,um diam orifice is 7.0 times greater than the x-ray flux previously reported by Gubarev et al. [M. Gubarev et al., J. Appl. Crystallogr. 33, 882 (2000)]. The x-ray flux from the microfocus system is also 2.6 times higher than that produced by a rotating anode generator equipped with a graded multilayer monochromator (green optic, Osmic Inc. CMF24-48-Cu6) and 40% less than that produced by a rotating anode generator with the newest design of graded multilayer monochromator (blue optic, Osmic, Inc. CMF12-38-Cu6). Both rotating anode generators operate at a power level of 5000 W, dissipating more than 100 times the power of our microfocus x-ray system. Diffraction data collected from small test crystals are of high quality. For example, 42 540 reflections collected at ambient temperature from a lysozyme crystal yielded R(sub sym)=5.0% for data extending to 1.70 A, and 4.8% for the complete set of data to 1.85 A. The amplitudes of the observed reflections were used to calculate difference electron density maps that revealed positions of structurally important ions and water molecules in the crystal of lysozyme using the phases calculated from the protein model.

New contrasts for x-ray imaging and synergy with optical imaging

NASA Astrophysics Data System (ADS)

Wang, Ge

2017-02-01

Due to its penetrating power, fine resolution, unique contrast, high-speed, and cost-effectiveness, x-ray imaging is one of the earliest and most popular imaging modalities in biomedical applications. Current x-ray radiographs and CT images are mostly on gray-scale, since they reflect overall energy attenuation. Recent advances in x-ray detection, contrast agent, and image reconstruction technologies have changed our perception and expectation of x-ray imaging capabilities, and generated an increasing interest in imaging biological soft tissues in terms of energy-sensitive material decomposition, phase-contrast, small angle scattering (also referred to as dark-field), x-ray fluorescence and luminescence properties. These are especially relevant to preclinical and mesoscopic studies, and potentially mendable for hybridization with optical molecular tomography. In this article, we review new x-ray imaging techniques as related to optical imaging, suggest some combined x-ray and optical imaging schemes, and discuss our ideas on micro-modulated x-ray luminescence tomography (MXLT) and x-ray modulated opto-genetics (X-Optogenetics).

Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Stoupin, Stanislav, E-mail: sstoupin@aps.anl.gov; Shvyd’ko, Yuri; Trakhtenberg, Emil

2016-07-27

We report progress on implementation and commissioning of sequential X-ray diffraction topography at 1-BM Optics Testing Beamline of the Advanced Photon Source to accommodate growing needs of strain characterization in diffractive crystal optics and other semiconductor single crystals. The setup enables evaluation of strain in single crystals in the nearly-nondispersive double-crystal geometry. Si asymmetric collimator crystals of different crystallographic orientations were designed, fabricated and characterized using in-house capabilities. Imaging the exit beam using digital area detectors permits rapid sequential acquisition of X-ray topographs at different angular positions on the rocking curve of a crystal under investigation. Results on sensitivity andmore » spatial resolution are reported based on experiments with high-quality Si and diamond crystals. The new setup complements laboratory-based X-ray topography capabilities of the Optics group at the Advanced Photon Source.« less

Few-femtosecond time-resolved measurements of X-ray free-electron lasers.

PubMed

Behrens, C; Decker, F-J; Ding, Y; Dolgashev, V A; Frisch, J; Huang, Z; Krejcik, P; Loos, H; Lutman, A; Maxwell, T J; Turner, J; Wang, J; Wang, M-H; Welch, J; Wu, J

2014-04-30

X-ray free-electron lasers, with pulse durations ranging from a few to several hundred femtoseconds, are uniquely suited for studying atomic, molecular, chemical and biological systems. Characterizing the temporal profiles of these femtosecond X-ray pulses that vary from shot to shot is not only challenging but also important for data interpretation. Here we report the time-resolved measurements of X-ray free-electron lasers by using an X-band radiofrequency transverse deflector at the Linac Coherent Light Source. We demonstrate this method to be a simple, non-invasive technique with a large dynamic range for single-shot electron and X-ray temporal characterization. A resolution of less than 1 fs root mean square has been achieved for soft X-ray pulses. The lasing evolution along the undulator has been studied with the electron trapping being observed as the X-ray peak power approaches 100 GW.

Observation of the strain field near the Si(111) 7 x 7 surface with a new X-ray diffraction technique.

PubMed

Emoto, T; Akimoto, K; Ichimiya, A

1998-05-01

A new X-ray diffraction technique has been developed in order to measure the strain field near a solid surface under ultrahigh vacuum (UHV) conditions. The X-ray optics use an extremely asymmetric Bragg-case bulk reflection. The glancing angle of the X-rays can be set near the critical angle of total reflection by tuning the X-ray energy. Using this technique, rocking curves for Si surfaces with different surface structures, i.e. a native oxide surface, a slightly oxide surface and an Si(111) 7 x 7 surface, were measured. It was found that the widths of the rocking curves depend on the surface structures. This technique is efficient in distinguishing the strain field corresponding to each surface structure.

The optical lens coupled X-ray in-line phase contrast imaging system for the characterization of low Z materials

NASA Astrophysics Data System (ADS)

Wang, Kai; Lin, Wei; Dai, Fei; Li, Jun; Qi, Xiaobo; Lei, Haile; Liu, Yuanqiong

2018-05-01

Due to the high spatial resolution and contrast, the optical lens coupled X-ray in-line phase contrast imaging system with the secondary optical magnification is more suitable for the characterization of the low Z materials. The influence of the source to object distance and the object to scintillator distance on the image resolution and contrast is studied experimentally. A phase correlation algorithm is used for the image mosaic of a serial of X-ray phase contrast images acquired with high resolution, the resulting resolution is less than 1.0 μm, and the whole field of view is larger than 1.4 mm. Finally, the geometric morphology and the inner structure of various weakly absorbing samples and the evaporation of water in the plastic micro-shell are in situ characterized by the optical lens coupled X-ray in-line phase contrast imaging system.

X-ray characterization of short-pulse laser illuminated hydrogen storage alloys having very high performance

NASA Astrophysics Data System (ADS)

Daido, Hiroyuki; Abe, Hiroshi; Shobu, Takahisa; Shimomura, Takuya; Tokuhira, Shinnosuke; Takenaka, Yusuke; Furuyama, Takehiro; Nishimura, Akihiko; Uchida, Hirohisa; Ohshima, Takeshi

2015-09-01

Hydrogen storage alloys become more and more important in the fields of electric energy production and stage and automobiles such as Ni-MH batteries. The vacancies introduced in hydrogen absorption alloy by charged particle beams were found to be positive effect on the increase in the initial hydrogen absorption reaction rate in the previous study. The initial reaction rates of hydrogen absorption and desorption of the alloy are one of the important performances to be improved. Here, we report on the characterization of the hydrogen absorption reaction rate directly illuminated by a femtosecond and nanosecond lasers instead of particle beam machines. A laser illuminates the whole surface sequentially on a tip of a few cm square LaNi4.6Al0.4 alloy resulting in significant improvement in the hydrogen absorption reaction rate. For characterization of the surface layer, we perform an x-ray diffraction experiment using a monochromatized intense x-ray beam from SPring-8 synchrotoron machine.

Characterizing automotive fuel cell materials by soft x-ray scanning transmission x-ray microscopy

NASA Astrophysics Data System (ADS)

Hitchcock, A. P.; Lee, V.; Wu, J.; West, M. M.; Cooper, G.; Berejnov, V.; Soboleva, T.; Susac, D.; Stumper, J.

2016-01-01

Proton-Exchange Membrane Fuel Cell (PEM-FC) based engines are being developed rapidly for near-term implementation in hydrogen fueled, mass production, personal automobiles. Research is focused on understanding and controlling various degradation processes (carbon corrosion, Pt migration, cold start), and reducing cost by reducing or eliminating Pt catalyst. We are using soft X-ray scanning transmission X-ray microscopy (STXM) at the S 2p, C 1s, O 1s and F 1s edges to study a variety of issues related to optimization of PEM-FC materials for automotive applications. A method to efficiently and accurately measure perfluorosulfonic acid distributions was developed and is being used to better understand how different loadings and preparation methods affect the ionomer distribution in the cathode. Progress towards an environmental cell capable of controlling the temperature and humidity of a PEM-FC sample in the STXM is described. Methods for studying the 3D chemical structure of PEM-FC are outlined.

Characterizing automotive fuel cell materials by soft x-ray scanning transmission x-ray microscopy

DOE Office of Scientific and Technical Information (OSTI.GOV)

Hitchcock, A. P., E-mail: aph@mcmaster.ca; Lee, V.; Wu, J.

Proton-Exchange Membrane Fuel Cell (PEM-FC) based engines are being developed rapidly for near-term implementation in hydrogen fueled, mass production, personal automobiles. Research is focused on understanding and controlling various degradation processes (carbon corrosion, Pt migration, cold start), and reducing cost by reducing or eliminating Pt catalyst. We are using soft X-ray scanning transmission X-ray microscopy (STXM) at the S 2p, C 1s, O 1s and F 1s edges to study a variety of issues related to optimization of PEM-FC materials for automotive applications. A method to efficiently and accurately measure perfluorosulfonic acid distributions was developed and is being used tomore » better understand how different loadings and preparation methods affect the ionomer distribution in the cathode. Progress towards an environmental cell capable of controlling the temperature and humidity of a PEM-FC sample in the STXM is described. Methods for studying the 3D chemical structure of PEM-FC are outlined.« less

The high-field magnet endstation for X-ray magnetic dichroism experiments at ESRF soft X-ray beamline ID32.

PubMed

Kummer, K; Fondacaro, A; Jimenez, E; Velez-Fort, E; Amorese, A; Aspbury, M; Yakhou-Harris, F; van der Linden, P; Brookes, N B

2016-03-01

A new high-field magnet endstation for X-ray magnetic dichroism experiments has been installed and commissioned at the ESRF soft X-ray beamline ID32. The magnet consists of two split-pairs of superconducting coils which can generate up to 9 T along the beam and up to 4 T orthogonal to the beam. It is connected to a cluster of ultra-high-vacuum chambers that offer a comprehensive set of surface preparation and characterization techniques. The endstation and the beam properties have been designed to provide optimum experimental conditions for X-ray magnetic linear and circular dichroism experiments in the soft X-ray range between 400 and 1600 eV photon energy. User operation started in November 2014.

A hard X-ray view of the soft excess in AGN

NASA Astrophysics Data System (ADS)

Boissay, R.; Ricci, C.; Paltani, S.

2017-10-01

A soft X-ray emission in excess of the extrapolation of the hard X-ray continuum is detected in many Seyfert 1 galaxies below 1 keV. To understand the uncertain nature of this soft excess, which could be due to warm Comptonization or to blurred ionized reflection, we consider the different behaviors of these models above 10 keV. We present the results of a study done on 102 Seyfert 1s from the Swift BAT 70-Month Hard X-ray Survey catalog. We have performed the joint spectral analysis of Swift/BAT and XMM-Newton data in order to get a hard X-ray view of the soft excess. We discuss the links between the soft-excess strength and the reflection at high energy, the slope of the continuum and the Eddington ratio. We compare our results to simulations of blurred ionized-reflection models and show that they are in contradiction. Indeed, we do not find the expected correlation between the reflection and the soft-excess strengths, neither in individual, nor in stacked spectra. We also present our current project of broadband fitting, using different models explaining the soft excess, to simultaneous XMM-Newton and NuSTAR observations of about ten objects of our sample.

Curved focusing crystals for hard X-ray astronomy

DOE Office of Scientific and Technical Information (OSTI.GOV)

Ferrari, C., E-mail: ferrari@imem.cnr.it; Buffagni, E.; Bonnini, E.

A lens made by a properly arranged array of crystals can be used to focus x-rays of energy ranging from 30 to 500 keV for x-ray astronomy. Mosaic or curved crystals can be employed as x-ray optical elements. In this work self standing curved focusing Si and GaAs crystals in which the lattice bending is induced by a controlled damaging process on one side of planar crystals are characterized. Diffraction profiles in Laue geometry have been measured in crystals at x-ray energies E = 17, 59 and 120 keV. An enhancement of diffraction efficiency is found in asymmetric geometries.

Diamond x-ray optics: Transparent, resilient, high-resolution, and wavefront preserving

DOE PAGES

Shvyd’ko, Yuri; Blank, Vladimir; Terentyev, Sergey

2017-06-09

Diamond features a unique combination of outstanding physical properties perfect for numerous x-ray optics applications, where traditional materials such as silicon fail to perform. In the last two decades, impressive progress has been achieved in synthesizing diamond with high crystalline perfection, in manufacturing efficient, resilient, high-resolution, wavefront-preserving diamond optical components, and in implementing them in cutting-edge x-ray instruments. Diamond optics are essential for tailoring x-rays to the most challenging needs of x-ray research. Furthermore, they are becoming vital for the generation of fully coherent hard x-rays by seeded x-ray free-electron lasers. In this article, we review progress in manufacturing flawlessmore » diamond crystal components and their applications in diverse x-ray optical devices, such as x-ray monochromators, beam splitters, high-reflectance backscattering mirrors, lenses, phase plates, diffraction gratings, bent-crystal spectrographs, and windows.« less

Simultaneous multiplexed materials characterization using a high-precision hard X-ray micro-slit array.

PubMed

Zhang, Fan; Allen, Andrew J; Levine, Lyle E; Mancini, Derrick C; Ilavsky, Jan

2015-05-01

The needs both for increased experimental throughput and for in operando characterization of functional materials under increasingly realistic experimental conditions have emerged as major challenges across the whole of crystallography. A novel measurement scheme that allows multiplexed simultaneous measurements from multiple nearby sample volumes is presented. This new approach enables better measurement statistics or direct probing of heterogeneous structure, dynamics or elemental composition. To illustrate, the submicrometer precision that optical lithography provides has been exploited to create a multiplexed form of ultra-small-angle scattering based X-ray photon correlation spectroscopy (USAXS-XPCS) using micro-slit arrays fabricated by photolithography. Multiplexed USAXS-XPCS is applied to follow the equilibrium dynamics of a simple colloidal suspension. While the dependence of the relaxation time on momentum transfer, and its relationship with the diffusion constant and the static structure factor, follow previous findings, this measurements-in-parallel approach reduces the statistical uncertainties of this photon-starved technique to below those associated with the instrument resolution. More importantly, we note the potential of the multiplexed scheme to elucidate the response of different components of a heterogeneous sample under identical experimental conditions in simultaneous measurements. In the context of the X-ray synchrotron community, this scheme is, in principle, applicable to all in-line synchrotron techniques. Indeed, it has the potential to open a new paradigm for in operando characterization of heterogeneous functional materials, a situation that will be even further enhanced by the ongoing development of multi-bend achromat storage ring designs as the next evolution of large-scale X-ray synchrotron facilities around the world.

Characterization of gallium arsenide X-ray mesa p-i-n photodiodes at room temperature

NASA Astrophysics Data System (ADS)

Lioliou, G.; Meng, X.; Ng, J. S.; Barnett, A. M.

2016-03-01

Two GaAs mesa p+-i-n+ photodiodes intended for photon counting X-ray spectroscopy, having an i layer thickness of 7 μm and diameter of 200 μm, have been characterized electrically, for their responsivity at the wavelength range 580 nm to 980 nm and one of them for its performance at detection of soft X-rays, at room temperature. Dark current and capacitance measurements as a function of applied forward and reverse bias are presented. The results show low leakage current densities, in the range of nA/cm2 at the maximum internal electric field (22 kV/cm). The unintentional doping concentration of the i layer, calculated from capacitance measurements, was found to be <1014 cm-3. Photocurrent measurements were performed under visible and near infrared light illumination for both diodes. The analysis of these measurements suggests the presence of a non-active (dead) layer (0.16 μm thickness) at the p+ side top contact interface, where the photogenerated carriers do not contribute to the photocurrent, possibly due to recombination. One of the diodes, D1, was also characterized as detector for room temperature photon counting X-ray spectroscopy; the best energy resolution achieved (FWHM) at 5.9 keV was 745 eV. The noise analysis of the system, based on spectra obtained at different shaping times and applied reverse biases, showed that the dominant source of noise is the dielectric noise. It was also calculated that there was at least (165±24) eV charge trapping noise at 0 V.

Characterization of multilayer coated replicated Wolter optics for imaging x-ray emission from pulsed power

DOE Office of Scientific and Technical Information (OSTI.GOV)

Ames, Andrew; Ampleford, David; Bourdon, Chris

Here, we have developed a process for indirectly coating small diameter electroformed nickel replicated optics with multilayers to increase their response at high energy (i.e. >10 keV). The ability to fabricate small diameter multilayer-coated full-shell Wolter X-ray optics with narrow bandpass opens the door to several applications within astronomy and also provides a path for cross-fertilization to other fields. We report on the characterization and evaluation of the first two prototype X-ray Wolter optics to be delivered to the Z Pulsed Power Facility at Sandia National Laboratories. The intent is to develop and field several optics as part of anmore » imaging system with targeted spectral ranges.« less

Characterization of multilayer coated replicated Wolter optics for imaging x-ray emission from pulsed power

DOE PAGES

Ames, Andrew; Ampleford, David; Bourdon, Chris; ...

2017-08-29

Here, we have developed a process for indirectly coating small diameter electroformed nickel replicated optics with multilayers to increase their response at high energy (i.e. >10 keV). The ability to fabricate small diameter multilayer-coated full-shell Wolter X-ray optics with narrow bandpass opens the door to several applications within astronomy and also provides a path for cross-fertilization to other fields. We report on the characterization and evaluation of the first two prototype X-ray Wolter optics to be delivered to the Z Pulsed Power Facility at Sandia National Laboratories. The intent is to develop and field several optics as part of anmore » imaging system with targeted spectral ranges.« less

Characterization of multilayer coated replicated Wolter optics for imaging x-ray emission from pulsed power

NASA Astrophysics Data System (ADS)

Ames, A.; Ampleford, D.; Bourdon, C.; Bruni, R.; Kilaru, K.; Kozioziemski, B.; Pivovaroff, M.; Ramsey, B.; Romaine, S.; Vogel, J.; Walton, C.; Wu, M.

2017-08-01

We have developed a process for indirectly coating arbitrarily small diameter electroformed nickel replicated optics with multilayers to increase their response at high energy (i.e. >10 keV). The ability to fabricate small diameter multilayer coated full shell Wolter X-ray optics with narrow bandpass opens the door to several applications within astronomy and also provides a path for cross-fertilization to other fields. We report on the characterization and evaluation of the first two prototype X-ray Wolter optics to be delivered to the Z Pulsed Power Facility at Sandia National Laboratories. The intent is to develop and field several optics as part of an imaging system with targeted spectral ranges.

X-ray verification of an optically aligned off-plane grating module

NASA Astrophysics Data System (ADS)

Donovan, Benjamin D.; McEntaffer, Randall L.; Tutt, James H.; DeRoo, Casey T.; Allured, Ryan; Gaskin, Jessica A.; Kolodziejczak, Jeffery J.

2018-01-01

Off-plane x-ray reflection gratings are theoretically capable of achieving high resolution and high diffraction efficiencies over the soft x-ray bandpass, making them an ideal technology to implement on upcoming x-ray spectroscopy missions. To achieve high effective area, these gratings must be aligned into grating modules. X-ray testing was performed on an aligned grating module to assess the current optical alignment methods. Results indicate that the grating module achieved the desired alignment for an upcoming x-ray spectroscopy suborbital rocket payload with modest effective area and resolving power. These tests have also outlined a pathway towards achieving the stricter alignment tolerances of future x-ray spectrometer payloads, which require improvements in alignment metrology, grating fabrication, and testing techniques.

Modeling the expected performance of the REgolith X-ray Imaging Spectrometer (REXIS)

NASA Astrophysics Data System (ADS)

Inamdar, Niraj K.; Binzel, Richard P.; Hong, Jae Sub; Allen, Branden; Grindlay, Jonathan; Masterson, Rebecca A.

2014-09-01

OSIRIS-REx is the third spacecraft in the NASA New Frontiers Program and is planned for launch in 2016. OSIRIS-REx will orbit the near-Earth asteroid (101955) Bennu, characterize it, and return a sample of the asteroid's regolith back to Earth. The Regolith X-ray Imaging Spectrometer (REXIS) is an instrument on OSIRIS-REx designed and built by students at MIT and Harvard. The purpose of REXIS is to collect and image sun-induced fluorescent X-rays emitted by Bennu, thereby providing spectroscopic information related to the elemental makeup of the asteroid regolith and the distribution of features over its surface. Telescopic reflectance spectra suggest a CI or CM chondrite analog meteorite class for Bennu, where this primitive nature strongly motivates its study. A number of factors, however, will influence the generation, measurement, and interpretation of the X-ray spectra measured by REXIS. These include: the compositional nature and heterogeneity of Bennu, the time-variable solar state, X-ray detector characteristics, and geometric parameters for the observations. In this paper, we will explore how these variables influence the precision to which REXIS can measure Bennu's surface composition. By modeling the aforementioned factors, we place bounds on the expected performance of REXIS and its ability to ultimately place Bennu in an analog meteorite class.

X-ray Polarimetry with a Micro-Pattern Gas Detector

NASA Technical Reports Server (NTRS)

Hill, Joe

2005-01-01

Topics covered include: Science drivers for X-ray polarimetry; Previous X-ray polarimetry designs; The photoelectric effect and imaging tracks; Micro-pattern gas polarimeter design concept. Further work includes: Verify results against simulator; Optimize pressure and characterize different gases for a given energy band; Optimize voltages for resolution and sensitivity; Test meshes with 80 micron pitch; Characterize ASIC operation; and Quantify quantum efficiency for optimum polarization sensitivity.

Characterization and analysis of Porous, Brittle solid structures by X-ray micro computed tomography

NASA Astrophysics Data System (ADS)

Lin, C. L.; Videla, A. R.; Yu, Q.; Miller, J. D.

2010-12-01

The internal structure of porous, brittle solid structures, such as porous rock, foam metal and wallboard, is extremely complex. For example, in the case of wallboard, the air bubble size and the thickness/composition of the wall structure are spatial parameters that vary significantly and influence mechanical, thermal, and acoustical properties. In this regard, the complex geometry and the internal texture of material, such as wallboard, is characterized and analyzed in 3-D using cone beam x-ray micro computed tomography. Geometrical features of the porous brittle structure are quantitatively analyzed based on calibration of the x-ray linear attenuation coefficient, use of a 3-D watershed algorithm, and use of a 3-D skeletonization procedure. Several examples of the 3-D analysis for porous, wallboard structures are presented and the results discussed.

The soft x-ray beamline at Frascati Labs

NASA Astrophysics Data System (ADS)

Cinque, Gianfelice; Burattini, Emilio; Grilli, Antonio; Dabagov, Sultan

2005-08-01

DAΦNE-Light is the Synchrotron Radiation laboratory at the Laboratori Nazionali di Frascati (LNF)1. Three beamlines were commissioned since spring 2003 to exploit parasitically the intense photon emission from DAΦNE, the 0.5 1 GeV storage ring routinely circulating over 1 A of electrons. The soft X-ray beamline utilizes a wiggler source and, by a double-crystal fixed-exit monochromator, it is operational in the distinguishing energy window 1.5 - 4 keV range to be extended from the "water window" toward 6 keV. At present, the research activity is focused on X-ray Absorption Spectroscopy (XAS): precisely, X-ray Absorption Near Edge Spectroscopy (XANES) on the inner electronic levels of light elements and transition metals from Al to Ge and both d- and f-shells of higher Z atoms. Preliminary tests of X-ray imaging have been performed in view of applying different focusing optics, namely policapillary systems in trasmission and/or bent mica diffractor in back-reflection, for X-ray microscopy and spectromicroscopy experiments. The use of polycapillary systems (lenses, halflenses, capillaries) for studying features of radiation transportation by such structures (X-ray channelling, focusing, bending, etc.) has been planned.

Resonant magnetic scattering of polarized soft x rays

DOE Office of Scientific and Technical Information (OSTI.GOV)

Sacchi, M.; Hague, C.F.; Gullikson, E.M.

1997-04-01

Magnetic effects on X-ray scattering (Bragg diffraction, specular reflectivity or diffuse scattering) are a well known phenomenon, and they also represent a powerful tool for investigating magnetic materials since it was shown that they are strongly enhanced when the photon energy is tuned across an absorption edge (resonant process). The resonant enhancement of the magnetic scattering has mainly been investigated at high photon energies, in order to match the Bragg law for the typical lattice spacings of crystals. In the soft X-ray range, even larger effects are expected, working for instance at the 2p edges of transition metals of themore » first row or at the 3d edges of rare earths (300-1500 eV), but the corresponding long wavelengths prevent the use of single crystals. Two approaches have been recently adopted in this energy range: (i) the study of the Bragg diffraction from artificial structures of appropriate 2d spacing; (ii) the analysis of the specular reflectivity, which contains analogous information but has no constraints related to the lattice spacing. Both approaches have their own specific advantages: for instance, working under Bragg conditions provides information about the (magnetic) periodicity in ordered structures, while resonant reflectivity can easily be related to electronic properties and absorption spectra. An important aspect common to all the resonant X-ray scattering techniques is the element selectivity inherent to the fact of working at a specific absorption edge: under these conditions, X-ray scattering becomes in fact a spectroscopy. Results are presented for films of iron and cobalt.« less

[Analysis and characterization of Belamcanda chinensis with space mutagenesis breeding by X-ray fluorescence analysis and X-ray diffraction].

PubMed

Guan, Ying; Ding, Xi-Feng; Wang, Wen-Jing; Guo, Xi-Hua; Zhu, Yan-Ying

2008-02-01

The contents of various elements in the fourth generation Belamcanda chinensis (L.) DC. with space mutagenesis breeding were analyzed and characterized. X-ray fluorescence spectrum analysis (XRF) and powder X-ray diffraction (PXRD) were applied jointly. It was found that the content of K element in the space flight mutagenesis increases 1.03 and 0.31 times, Mg enhances 1.44 and 0.06 times, but Al reduces 38.5% and 85.5% respectively compared to the contents in the ground group and the comparison group, while those of Ca, Mn and Fe enhance 0.95, 0.30 and 0.29 times respectively contrasted to the ground group. Besides, there was discovered the crystal of whewellite in the Belamcanda chinensis (L.) DC. and the content in the ground group is less than that of the outer space and the outer space group, which in turn is less than that of the comparison group. It is concluded that the contents of mineral elements indispensable to body in the space group are closer or superior to the comparison, group as compared to the ground group. In the present paper, a quick and simple appraising method is offered, which may be of great significance to the popularization of the planting outer space Chinese traditional medicine to filtrate more excellent breed and set up norm of quality appraisal.

Tissue Equivalent Phantom Design for Characterization of a Coherent Scatter X-ray Imaging System

NASA Astrophysics Data System (ADS)

Albanese, Kathryn Elizabeth

Scatter in medical imaging is typically cast off as image-related noise that detracts from meaningful diagnosis. It is therefore typically rejected or removed from medical images. However, it has been found that every material, including cancerous tissue, has a unique X-ray coherent scatter signature that can be used to identify the material or tissue. Such scatter-based tissue-identification provides the advantage of locating and identifying particular materials over conventional anatomical imaging through X-ray radiography. A coded aperture X-ray coherent scatter spectral imaging system has been developed in our group to classify different tissue types based on their unique scatter signatures. Previous experiments using our prototype have demonstrated that the depth-resolved coherent scatter spectral imaging system (CACSSI) can discriminate healthy and cancerous tissue present in the path of a non-destructive x-ray beam. A key to the successful optimization of CACSSI as a clinical imaging method is to obtain anatomically accurate phantoms of the human body. This thesis describes the development and fabrication of 3D printed anatomical scatter phantoms of the breast and lung. The purpose of this work is to accurately model different breast geometries using a tissue equivalent phantom, and to classify these tissues in a coherent x-ray scatter imaging system. Tissue-equivalent anatomical phantoms were designed to assess the capability of the CACSSI system to classify different types of breast tissue (adipose, fibroglandular, malignant). These phantoms were 3D printed based on DICOM data obtained from CT scans of prone breasts. The phantoms were tested through comparison of measured scatter signatures with those of adipose and fibroglandular tissue from literature. Tumors in the phantom were modeled using a variety of biological tissue including actual surgically excised benign and malignant tissue specimens. Lung based phantoms have also been printed for future

Three mirror glancing incidence system for X-ray telescope

NASA Technical Reports Server (NTRS)

Hoover, R. B. (Inventor)

1974-01-01

A telescope suitable for soft X-ray astronomical observations consists of a paraboloid section for receiving rays at a grazing angle and a hyperboloid section which receives reflections from the paraboloid at a grazing angle and directs them to a predetermined point of focus. A second hyperboloid section is centrally located from the other two surfaces and positioned to reflect from its outer surface radiation which was not first reflected by the paraboloid. A shutter is included to assist in calibration.

A NuSTAR Observation of the Reflection Spectrum of the Low-Mass X-Ray Binary 4U 1728-34

NASA Technical Reports Server (NTRS)

Sleator, Clio C.; Tomsick, John A.; King, Ashley L.; Miller, Jon M.; Boggs, Steven E.; Bachetti, Matteo; Barret, Didier; Chenevez, Jerome; Christensen, Finn E.; Craig, William W.;

Development of microchannel plate x-ray optics

NASA Technical Reports Server (NTRS)

Kaaret, Philip

1995-01-01

The goal of this research program was to develop a novel technique for focusing x-rays based on the optical system of a lobster's eye. A lobster eye employs many closely packed reflecting surfaces arranged within a spherical or cylindrical shell. These optics have two unique properties: they have unlimited fields of view and can be manufactured via replication of identical structures. Because the angular resolution is given by the ratio of the size of the individual optical elements to the focal length, optical elements with size on the order of one hundred microns are required to achieve good angular resolution with a compact telescope. We employed anisotropic etching of single crystal silicon wafers for the fabrication of micron-scale optical elements. This technique, commonly referred to as silicon micromachining, is based on silicon fabrication techniques developed by the microelectronics industry. We have succeeded in producing silicon lenses with a geometry suitable for a 1-d focusing x-ray optics. These lenses have an aspect ratio (40:1) suitable for x-ray reflection and have very good optical surface alignment. We have developed a number of process refinements which improved the quality of the lens geometry and the repeatability of the etch process. In addition to the silicon fabrication, an x-ray beam line was constructed at Columbia for testing the optics. Most recently, we have done several experiments to find the fundamental limits that the anisotropic etch process placed on the etched surface roughness.

Search for Hard X-Ray Emission from the Soft X-Ray Transient Aquila X-1

NASA Astrophysics Data System (ADS)

Harmon, B. A.; Zhang, S. N.; Paciesas, W. S.; Tavani, M.; Kaaret, P.; Ford, E.

1994-12-01

We are investigating the possibility of hard x-ray emission from the recurrent soft x-ray transient and x-ray burst source Aquila X-1 (Aql X-1). Outbursts of this source are relatively frequent with a spacing of ~ 4-10 months (Kitamoto, S. et al. 1993, ApJ, 403, 315). The recent detections of hard tails (\\(>\\)20 keV) in low luminosity x-ray bursters (Barret, D. & Vedrenne, G. 1994, ApJ Supp. S. 92, 505) suggest that neutron star transient systems such as Aql X-1 can produce hard x-ray emission which is detectable by BATSE. We are correlating reported optical and soft x-ray observations since 1991 of Aql X-1 with BATSE observations in order to search for hard x-ray emission episodes, and to study their temporal and spectral evolution. We will present preliminary results of this search in the 20-1000 keV band using the Earth occultation technique applied to the large area detectors. If this work is successful, we hope to alert the astronomical community for the next Aql X-1 outburst expected in 1995. Simultaneous x-ray/hard x-ray and optical observations of Aql X-1 during outburst would be of great importance for the modeling of soft x-ray transients and related systems.

Characterizing Intermediate-Mass, Pre-Main-Sequence Stars via X-Ray Emision

NASA Astrophysics Data System (ADS)

Haze Nunez, Evan; Povich, Matthew Samuel; Binder, Breanna Arlene; Broos, Patrick; Townsley, Leisa K.

2018-01-01

The X-ray emission from intermediate-mass, pre-main-sequence stars (IMPS) can provide useful constraints on the ages of very young (${<}5$~Myr) massive star forming regions. IMPS have masses between 2 and 8 $M_{\\odot}$ and are getting power from the gravitational contraction of the star. Main-sequence late-B and A-type stars are not expected to be strong X-ray emitters, because they lack the both strong winds of more massive stars and the magneto-coronal activity of lower-mass stars. There is, however, mounting evidence that IMPS are powerful intrinsic x-ray emitters during their convection-dominated early evolution, before the development and rapid growth of a radiation zone. We present our prime candidates for intrinsic, coronal X-ray emission from IMPS identified in the Chandra Carina Complex Project. The Carina massive star-forming complex is of special interest due to the wide variation of star formation stages within the region. Candidate IMPS were identified using infrared spectral energy distribution (SED) models. X-ray properties, including thermal plasma temperatures and absorption-corrected fluxes, were derived from XSPEC fits performed using absorption ($N_{H}$) constrained by the extinction values returned by the infrared SED fits. We find that IMPS have systematically higher X-ray luminosities compared to their lower-mass cousins, the TTauri stars.This work is supported by the National Science Foundation under grant CAREER-1454334 and by NASA through Chandra Award 18200040.

Technology Requirements for a Square Meter, Arcsecond Resolution Telescope for X-Rays: The SMART-X Mission

NASA Technical Reports Server (NTRS)

Schwartz, Daniel A.; Allured, Ryan; Bookbinder, Jay A.; Cotroneo, Vincenzo; Forman, William R.; Freeman, Mark D.; McMuldroch, Stuart; Reid, Paul B.; Tananbaum, Harvey; Vikhlinin, Alexey A.;

Characterization of Colloidal Quantum Dot Ligand Exchange by X-ray Photoelectron Spectroscopy

NASA Astrophysics Data System (ADS)

Atewologun, Ayomide; Ge, Wangyao; Stiff-Roberts, Adrienne D.

2013-05-01

Colloidal quantum dots (CQDs) are chemically synthesized semiconductor nanoparticles with size-dependent wavelength tunability. Chemical synthesis of CQDs involves the attachment of long organic surface ligands to prevent aggregation; however, these ligands also impede charge transport. Therefore, it is beneficial to exchange longer surface ligands for shorter ones for optoelectronic devices. Typical characterization techniques used to analyze surface ligand exchange include Fourier-transform infrared spectroscopy, x-ray diffraction, transmission electron microscopy, and nuclear magnetic resonance spectroscopy, yet these techniques do not provide a simultaneously direct, quantitative, and sensitive method for evaluating surface ligands on CQDs. In contrast, x-ray photoelectron spectroscopy (XPS) can provide nanoscale sensitivity for quantitative analysis of CQD surface ligand exchange. A unique aspect of this work is that a fingerprint is identified for shorter surface ligands by resolving the regional XPS spectrum corresponding to different types of carbon bonds. In addition, a deposition technique known as resonant infrared matrix-assisted pulsed laser evaporation is used to improve the CQD film uniformity such that stronger XPS signals are obtained, enabling more accurate analysis of the ligand exchange process.

Lasers, extreme UV and soft X-ray

DOE Office of Scientific and Technical Information (OSTI.GOV)

Nilsen, Joseph

2015-09-20

Three decades ago, large ICF lasers that occupied entire buildings were used as the energy sources to drive the first X-ray lasers. Today X-ray lasers are tabletop, spatially coherent, high-repetition rate lasers that enable many of the standard optical techniques such as interferometry to be extended to the soft X-ray regime between wavelengths of 10 and 50 nm. Over the last decade X-ray laser performance has been improved by the use of the grazing incidence geometry, diode-pumped solid-state lasers, and seeding techniques. The dominant X-ray laser schemes are the monopole collisional excitation lasers either driven by chirped pulse amplification (CPA)more » laser systems or capillary discharge. The CPA systems drive lasing in neon-like or nickel-like ions, typically in the 10 – 30 nm range, while the capillary system works best for neon-like argon at 46.9 nm. Most researchers use nickel-like ion lasers near 14 nm because they are well matched to the Mo:Si multilayer mirrors that have peak reflectivity near 13 nm and are used in many applications. As a result, the last decade has seen the birth of the X-ray free electron laser (XFEL) that can reach wavelengths down to 0.15 nm and the inner-shell Ne laser at 1.46 nm.« less

All-diamond optical assemblies for a beam-multiplexing X-ray monochromator at the Linac Coherent Light Source

PubMed Central

Stoupin, S.; Terentyev, S. A.; Blank, V. D.; Shvyd’ko, Yu. V.; Goetze, K.; Assoufid, L.; Polyakov, S. N.; Kuznetsov, M. S.; Kornilov, N. V.; Katsoudas, J.; Alonso-Mori, R.; Chollet, M.; Feng, Y.; Glownia, J. M.; Lemke, H.; Robert, A.; Sikorski, M.; Song, S.; Zhu, D.

2014-01-01

A double-crystal diamond (111) monochromator recently implemented at the Linac Coherent Light Source (LCLS) enables splitting of the primary X-ray beam into a pink (transmitted) and a monochromatic (reflected) branch. The first monochromator crystal, with a thickness of ∼100 µm, provides sufficient X-ray transmittance to enable simultaneous operation of two beamlines. This article reports the design, fabrication and X-ray characterization of the first and second (300 µm-thick) crystals utilized in the monochromator and the optical assemblies holding these crystals. Each crystal plate has a region of about 5 × 2 mm with low defect concentration, sufficient for use in X-ray optics at the LCLS. The optical assemblies holding the crystals were designed to provide mounting on a rigid substrate and to minimize mounting-induced crystal strain. The induced strain was evaluated using double-crystal X-ray topography and was found to be small over the 5 × 2 mm working regions of the crystals. PMID:25242912

Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation

NASA Technical Reports Server (NTRS)

Gendreau, Keith (Inventor); Martins, Jose Vanderlei (Inventor); Arzoumanian, Zaven (Inventor)

2010-01-01

An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.

Contact x-ray microscopy using Asterix

NASA Astrophysics Data System (ADS)

Conti, Aldo; Batani, Dimitri; Botto, Cesare; Masini, Alessandra; Bernardinello, A.; Bortolotto, Fulvia; Moret, M.; Poletti, G.; Piccoli, S.; Cotelli, F.; Lora Lamia Donin, C.; Stead, Anthony D.; Marranca, A.; Eidmann, Klaus; Flora, Francesco; Palladino, Libero; Reale, Lucia

1997-10-01

The use of a high energy laser source for soft x-ray contact microscopy is discussed. Several different targets were used and their emission spectra compared. The x-ray emission, inside and outside the Water Window, was characterized in detail by means of many diagnostics, including pin hole and streak cameras. Up to 12 samples holders per shot were exposed thanks to the large x-ray flux and the geometry of the interaction chamber. Images of several biological samples were obtained, including Chlamydomonas and Crethidia green algae, fish and boar sperms and Saccharomyces Cerevisiae yeast cells. A 50 nm resolution was reached on the images of boar sperm. Original information concerning the density of inner structures of Crethidia green algae were obtained.

Ray-tracing critical-angle transmission gratings for the X-ray Surveyor and Explorer-size missions

NASA Astrophysics Data System (ADS)

Günther, Hans M.; Bautz, Marshall W.; Heilmann, Ralf K.; Huenemoerder, David P.; Marshall, Herman L.; Nowak, Michael A.; Schulz, Norbert S.

2016-07-01

We study a critical angle transmission (CAT) grating spectrograph that delivers a spectral resolution significantly above any X-ray spectrograph ever own. This new technology will allow us to resolve kinematic components in absorption and emission lines of galactic and extragalactic matter down to unprecedented dispersion levels. We perform ray-trace simulations to characterize the performance of the spectrograph in the context of an X-ray Surveyor or Arcus like layout (two mission concepts currently under study). Our newly developed ray-trace code is a tool suite to simulate the performance of X-ray observatories. The simulator code is written in Python, because the use of a high-level scripting language allows modifications of the simulated instrument design in very few lines of code. This is especially important in the early phase of mission development, when the performances of different configurations are contrasted. To reduce the run-time and allow for simulations of a few million photons in a few minutes on a desktop computer, the simulator code uses tabulated input (from theoretical models or laboratory measurements of samples) for grating efficiencies and mirror reflectivities. We find that the grating facet alignment tolerances to maintain at least 90% of resolving power that the spectrometer has with perfect alignment are (i) translation parallel to the optical axis below 0.5 mm, (ii) rotation around the optical axis or the groove direction below a few arcminutes, and (iii) constancy of the grating period to 1:105. Translations along and rotations around the remaining axes can be significantly larger than this without impacting the performance.

Impact of Lipid Oxidization on Vertical Structures and Electrostatics of Phospholipid Monolayers Revealed by Combination of Specular X-ray Reflectivity and Grazing-Incidence X-ray Fluorescence.

PubMed

Korytowski, Agatha; Abuillan, Wasim; Makky, Ali; Konovalov, Oleg; Tanaka, Motomu

2015-07-30

The influence of phospholipid oxidization of floating monolayers on the structure perpendicular to the global plane and on the density profiles of ions near the lipid monolayer has been investigated by a combination of grazing incidence X-ray fluorescence (GIXF) and specular X-ray reflectivity (XRR). Systematic variation of the composition of the floating monolayers unravels changes in the thickness, roughness and electron density of the lipid monolayers as a function of molar fraction of oxidized phospholipids. Simultaneous GIXF measurements enable one to qualitatively determine the element-specific density profiles of monovalent (K(+) or Cs(+)) and divalent ions (Ca(2+)) in the vicinity of the interface in the presence and absence of two types of oxidized phospholipids (PazePC and PoxnoPC) with high spatial accuracy (±5 Å). We found the condensation of Ca(2+) near carboxylated PazePC was more pronounced compared to PoxnoPC with an aldehyde group. In contrast, the condensation of monovalent ions could hardly be detected even for pure oxidized phospholipid monolayers. Moreover, pure phospholipid monolayers exhibited almost no ion specific condensation near the interface. The quantitative studies with well-defined floating monolayers revealed how the elevation of lipid oxidization level alters the structures and functions of cell membranes.

X-ray rocking curve measurements of bent crystals. [used in High Resolution Spectrometer in Advanced X-ray Astrophysics Facility

NASA Technical Reports Server (NTRS)

Hakim, M. B.; Muney, W. S.; Fowler, W. B.; Woodgate, B. E.

1988-01-01

A three-crystal laboratory X-ray spectrometer is used to measure the Bragg reflection from concave cylindrically curved crystals to be used in the high-resolution X-ray spectrometer of the NASA Advanced X-ray Astrophysics Facility (AXAF). The first two crystals, in the dispersive (1.1) arrangement, select a narrow collimated monochromatic beam in the Cu K-alpha(1) line at 1.5 A (8.1 keV), which illuminates the test crystal. The angular centroids of rocking curves measured along the surface provide a measure of the conformity of the crystal to the desired radius of curvature. Individual and combined rocking-curve widths and areas provide a measure of the resolution and efficiency at 1.54 A. The crystals analyzed included LiF(200), PET, and acid phthalates such as TAP.

X-ray near-field speckle: implementation and critical analysis

PubMed Central

Lu, Xinhui; Mochrie, S. G. J.; Narayanan, S.; Sandy, A. R.; Sprung, M.

2011-01-01

The newly introduced coherence-based technique of X-ray near-field speckle (XNFS) has been implemented at 8-ID-I at the Advanced Photon Source. In the near-field regime of high-brilliance synchrotron X-rays scattered from a sample of interest, it turns out that, when the scattered radiation and the main beam both impinge upon an X-ray area detector, the measured intensity shows low-contrast speckles, resulting from interference between the incident and scattered beams. A micrometer-resolution XNFS detector with a high numerical aperture microscope objective has been built and its capability for studying static structures and dynamics at longer length scales than traditional far-field X-ray scattering techniques is demonstrated. Specifically, the dynamics of dilute silica and polystyrene colloidal samples are characterized. This study reveals certain limitations of the XNFS technique, especially in the characterization of static structures, which is discussed. PMID:21997906

Physics of reflective optics for the soft gamma-ray photon energy range

DOE PAGES

Fernandez-Perea, Monica; Descalle, Marie -Anne; Soufli, Regina; ...

2013-07-12

Traditional multilayer reflective optics that have been used in the past for imaging at x-ray photon energies as high as 200 keV are governed by classical wave phenomena. However, their behavior at higher energies is unknown, because of the increasing effect of incoherent scattering and the disagreement between experimental and theoretical optical properties of materials in the hard x-ray and gamma-ray regimes. Here, we demonstrate that multilayer reflective optics can operate efficiently and according to classical wave physics up to photon energies of at least 384 keV. We also use particle transport simulations to quantitatively determine that incoherent scattering takesmore » place in the mirrors but it does not affect the performance at the Bragg angles of operation. Furthermore, our results open up new possibilities of reflective optical designs in a spectral range where only diffractive optics (crystals and lenses) and crystal monochromators have been available until now.« less

NEAR Gamma Ray Spectrometer Characterization and Repair

NASA Technical Reports Server (NTRS)

Groves, Joel Lee; Vajda, Stefan

1998-01-01

This report covers the work completed in the third year of the contract. The principle activities during this period were (1) the characterization of the NEAR 2 Gamma Ray Spectrometer using a neutron generator to generate complex gamma ray spectra and a large Ge Detecter to identify all the major peaks in the spectra; (2) the evaluation and repair of the Engineering Model Unit of the Gamma Ray Spectrometer for the NEAR mission; (3) the investigation of polycapillary x-ray optics for x-ray detection; and (4) technology transfer from NASA to forensic science.

Is there a UV/X-ray connection in IRAS 13224-3809?

NASA Astrophysics Data System (ADS)

Buisson, D. J. K.; Lohfink, A. M.; Alston, W. N.; Cackett, E. M.; Chiang, C.-Y.; Dauser, T.; De Marco, B.; Fabian, A. C.; Gallo, L. C.; García, J. A.; Jiang, J.; Kara, E.; Middleton, M. J.; Miniutti, G.; Parker, M. L.; Pinto, C.; Uttley, P.; Walton, D. J.; Wilkins, D. R.

2018-04-01

We present results from the optical, ultraviolet, and X-ray monitoring of the NLS1 galaxy IRAS 13224-3809 taken with Swift and XMM-Newton during 2016. IRAS 13224-3809 is the most variable bright AGN in the X-ray sky and shows strong X-ray reflection, implying that the X-rays strongly illuminate the inner disc. Therefore, it is a good candidate to study the relationship between coronal X-ray and disc UV emission. However, we find no correlation between the X-ray and UV flux over the available ˜40 d monitoring, despite the presence of strong X-ray variability and the variable part of the UV spectrum being consistent with irradiation of a standard thin disc. This means either that the X-ray flux which irradiates the UV emitting outer disc does not correlate with the X-ray flux in our line of sight and/or that another process drives the majority of the UV variability. The former case may be due to changes in coronal geometry, absorption or scattering between the corona and the disc.

X-Ray Polarization from High Mass X-Ray Binaries

NASA Technical Reports Server (NTRS)

Kallman, T.; Dorodnitsyn, A.; Blondin, J.

2015-01-01

X-ray astronomy allows study of objects which may be associated with compact objects, i.e. neutron stars or black holes, and also may contain strong magnetic fields. Such objects are categorically non-spherical, and likely non-circular when projected on the sky. Polarization allows study of such geometric effects, and X-ray polarimetry is likely to become feasible for a significant number of sources in the future. A class of potential targets for future X-ray polarization observations is the high mass X-ray binaries (HMXBs), which consist of a compact object in orbit with an early type star. In this paper we show that X-ray polarization from HMXBs has a distinct signature which depends on the source inclination and orbital phase. The presence of the X-ray source displaced from the star creates linear polarization even if the primary wind is spherically symmetric whenever the system is viewed away from conjunction. Direct X-rays dilute this polarization whenever the X-ray source is not eclipsed; at mid-eclipse the net polarization is expected to be small or zero if the wind is circularly symmetric around the line of centers. Resonance line scattering increases the scattering fraction, often by large factors, over the energy band spanned by resonance lines. Real winds are not expected to be spherically symmetric, or circularly symmetric around the line of centers, owing to the combined effects of the compact object gravity and ionization on the wind hydrodynamics. A sample calculation shows that this creates polarization fractions ranging up to tens of percent at mid-eclipse.

Nanofabrication and characterization of a grating-based condenser for uniform illumination with hard X-rays.

PubMed

Liu, Jianpeng; Li, Xin; Chen, Shuo; Zhang, Sichao; Xie, Shanshan; Xu, Chen; Chen, Yifang; Deng, Biao; Mao, Chenwen

2017-05-01

In the development of full-field transmission X-ray microscopy for basic study in science and technology, a condenser capable of providing intense illumination with high uniformity and stability on tested specimens in order to achieve high-quality images is essential. The latest design of a square-shaped condenser based on diffractive gratings has demonstrated promising uniformity in illumination. This paper describes in more detail the development of such a beam shaper for hard X-rays at 10 keV with regard to its design, manufacture and optical characterization. The effect of the grating profile on the diffracted intensity has been theoretically predicted by numerical simulation using the finite-difference time-domain method. Based on this, the limitations of the grating-based condenser are discussed.

Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Ju, Guangxu; Highland, Matthew J.; Thompson, Carol

In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory tomore » obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator ('pink beam') agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. As a result, the methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines.« less

Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source

DOE PAGES

Ju, Guangxu; Highland, Matthew J.; Thompson, Carol; ...

2018-06-13

In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory tomore » obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator ('pink beam') agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. As a result, the methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines.« less

Characterization of ceramic powders by an X-ray measuring method

NASA Technical Reports Server (NTRS)

Ziegler, B.

1983-01-01

X-ray line broadening analysis gives quantitative data on structural changes of ceramic powders after different processing steps. Various Al2O3 powders were investigated and the following points are discussed on the basis of these results: X-ray line broadening analysis, structural changes during grinding, structural changes during annealing, influence of structural properties on sintering behavior and application of line broadening analysis to quality control of powders.

Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism

DOE PAGES

Braig, Christoph; Lochel, Heike; Firsov, Alexander; ...

2015-12-17

Here, the feasibility of an off-axis x-ray reflection zone plate to perform wavelength-dispersive spectroscopy, on-axis point focusing, and two-dimensional imaging is demonstrated by means of one and the same diffractive optical element (DOE) at a synchrotron radiation facility. The resolving power varies between 3 × 10 1 and 4 × 10 2 in the range of 7.6 keV to 9.0 keV, with its maximum at the design energy of 8.3 keV. This result is verified using an adjustable entrance slit, by which horizontal (H) and vertical (V) focusing to 0.85 μm(H) and 1.29 μm(V) is obtained near the sagittal focalmore » plane of the astigmatic configuration. An angular and axial scan proves an accessible field of view of at least 0.6 arcmin × 0.8 arcmin and a focal depth of ±0.86 mm. Supported by the grating efficiency of around 17.5% and a very short pulse elongation, future precision x-ray fluorescence and absorption studies of transition metals at their K-edge on an ultrashort timescale could benefit from our findings.« less

Long-Term Variability of AGN at Hard X-Rays

NASA Technical Reports Server (NTRS)

Soldi, S.; Beckmann, V.; Baumgartner W. H.; Ponti, G.; Shrader, C. R.; Lubinski, P.; Krimm, H. A.; Mattana, F.; Tueller, J.

2013-01-01

Variability at all observed wavelengths is a distinctive property of active galactic nuclei (AGN). Hard X-rays provide us with a view of the innermost regions of AGN, mostly unbiased by absorption along the line of sight. Characterizing the intrinsic hard X-ray variability of a large AGN sample and comparing it to the results obtained at lower X-ray energies can significantly contribute to our understanding of the mechanisms underlying the high-energy radiation. Methods. Swift/BAT provides us with the unique opportunity to follow, on time scales of days to years and with a regular sampling, the 14-195 keV emission of the largest AGN sample available up to date for this kind of investigation. As a continuation of an early work on the first 9 months of BAT data, we study the amplitude of the variations, and their dependence on sub-class and on energy, for a sample of 110 radio quiet and radio loud AGN selected from the BAT 58-month survey. About 80 of the AGN in the sample are found to exhibit significant variability on months to years time scales, radio loud sources being the most variable. The amplitude of the variations and their energy dependence are incompatible with variability being driven at hard X-rays by changes of the absorption column density. In general, the variations in the 14-24 and 35-100 keV bands are well correlated, suggesting a common origin of the variability across the BAT energy band. However, radio quiet AGN display on average 10 larger variations at 14-24 keV than at 35-100 keV and a softer-when-brighter behavior for most of the Seyfert galaxies with detectable spectral variability on month time scale. In addition, sources with harder spectra are found to be more variable than softer ones. These properties are generally consistent with a variable power law continuum, in flux and shape, pivoting at energies 50 keV, to which a constant reflection component is superposed. When the same time scales are considered, the timing properties of AGN at

Be/X-ray Binary Science for Future X-ray Timing Missions

NASA Technical Reports Server (NTRS)

Wilson-Hodge, Colleen A.

2011-01-01

For future missions, the Be/X-ray binary community needs to clearly define our science priorities for the future to advocate for their inclusion in future missions. In this talk, I will describe current designs for two potential future missions and Be X-ray binary science enabled by these designs. The Large Observatory For X-ray Timing (LOFT) is an X-ray timing mission selected in February 2011 for the assessment phase from the 2010 ESA M3 call for proposals. The Advanced X-ray Timing ARray (AXTAR) is a NASA explorer concept X-ray timing mission. This talk is intended to initiate discussions of our science priorities for the future.

The Massive Star-Forming Regions Omnibus X-Ray Catalog

NASA Astrophysics Data System (ADS)

Townsley, Leisa K.; Broos, Patrick S.; Garmire, Gordon P.; Bouwman, Jeroen; Povich, Matthew S.; Feigelson, Eric D.; Getman, Konstantin V.; Kuhn, Michael A.

2014-07-01

We present the Massive Star-forming Regions (MSFRs) Omnibus X-ray Catalog (MOXC), a compendium of X-ray point sources from Chandra/ACIS observations of a selection of MSFRs across the Galaxy, plus 30 Doradus in the Large Magellanic Cloud. MOXC consists of 20,623 X-ray point sources from 12 MSFRs with distances ranging from 1.7 kpc to 50 kpc. Additionally, we show the morphology of the unresolved X-ray emission that remains after the cataloged X-ray point sources are excised from the ACIS data, in the context of Spitzer and WISE observations that trace the bubbles, ionization fronts, and photon-dominated regions that characterize MSFRs. In previous work, we have found that this unresolved X-ray emission is dominated by hot plasma from massive star wind shocks. This diffuse X-ray emission is found in every MOXC MSFR, clearly demonstrating that massive star feedback (and the several-million-degree plasmas that it generates) is an integral component of MSFR physics.

On the X-ray spectra of luminous, inhomogeneous accretion flows

NASA Astrophysics Data System (ADS)

Merloni, A.; Malzac, J.; Fabian, A. C.; Ross, R. R.

2006-08-01

We discuss the expected X-ray spectral and variability properties of black hole accretion discs at high luminosity, under the hypothesis that radiation-pressure-dominated discs are subject to violent clumping instabilities and, as a result, have a highly inhomogeneous two-phase structure. After deriving the full accretion disc solutions explicitly in terms of the parameters of the model, we study their radiative properties both with a simple two-zone model, treatable analytically, and with radiative transfer simulations which account simultaneously for energy balance and Comptonization in the hot phase, together with reflection, reprocessing, ionization and thermal balance in the cold phase. We show that, if not only the density, but also the heating rate within these flows is inhomogeneous, then complex reflection-dominated spectra can be obtained for a high enough covering fraction of the cold phase. In general, large reflection components in the observed X-ray spectra should be associated with strong soft excesses, resulting from the combined emission of ionized atomic emission lines. The variability properties of such systems are such that, even when contributing to a large fraction of the hard X-ray spectrum, the reflection component is less variable than the power-law-like emission originating from the hot Comptonizing phase, in agreement with what is observed in many Narrow Line Seyfert 1 galaxies and bright Seyfert 1. Our model falls within the family of those trying to explain the complex X-ray spectra of bright AGN with ionized reflection, but presents an alternative, specific, physically motivated, geometrical set-up for the complex multiphase structure of the inner regions of near-Eddington accretion flows.

Abdomen X-Ray (Radiography)

MedlinePlus

... News Physician Resources Professions Site Index A-Z X-ray (Radiography) - Abdomen Abdominal x-ray uses a ... of an abdominal x-ray? What is abdominal x-ray? An x-ray (radiograph) is a noninvasive ...

Using X-ray Thomson Scattering to Characterize Highly Compressed, Near-Degenerate Plasmas at the NIF

NASA Astrophysics Data System (ADS)

Doeppner, Tilo; Kraus, D.; Neumayer, P.; Bachmann, B.; Divol, L.; Kritcher, A. L.; Landen, O. L.; Fletcher, L.; Glenzer, S. H.; Falcone, R. W.; MacDonald, M. J.; Saunders, A.; Witte, B.; Redmer, R.; Chapman, D.; Baggott, R.; Gericke, D. O.; Yi, S. A.

2017-10-01

We are developing x-ray Thomson scattering for implosion experiments at the National Ignition Facility to characterize plasma conditions in plastic and beryllium capsules near stagnation, reaching more than 20x compression and electron densities of 1025 cm-3, corresponding to a Fermi energy of 170 eV. Using a zinc He- α x-ray source at 9 keV, experiments at a large scattering angle of 120° measure non-collective scattering spectra with high sensitivity to K-shell ionization, and find higher charge states than predicted by widely used ionization models. Reducing the scattering angle to 30° probes the collective scattering regime with sensitivity to collisions and conductivity. We will discuss recent results and future plans. This work was performed under the auspices of the US Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344.

Discovery and development of x-ray diffraction

NASA Astrophysics Data System (ADS)

Jeong, Yeuncheol; Yin, Ming; Datta, Timir

2013-03-01

In 1912 Max Laue at University of Munich reasoned x-rays to be short wavelength electromagnetic waves and figured interference would occur when scattered off crystals. Arnold Sommerfeld, W. Wien, Ewald and others, raised objections to Laue's idea, but soon Walter Friedrich succeeded in recording x-ray interference patterns off copper sulfate crystals. But the Laue-Ewald's 3-dimensional formula predicted excess spots. Fewer spots were observed. William Lawrence Bragg then 22 year old studying at Cambridge University heard the Munich results from father William Henry Brag, physics professor at Univ of Leeds. Lawrence figured the spots are 2-d interference of x-ray wavelets reflecting off successive atomic planes and derived a simple eponymous equation, the Bragg equation d*sin(theta) = n*lamda. 1913 onward the Braggs dominated the crystallography. Max Laue was awarded the physics Nobel in 1914 and the Braggs shared the same in 1915. Starting with Rontgen's first ever prize in 1901, the importance of x-ray techniques is evident from the four out of a total 16 physics Nobels between 1901-1917. We will outline the historical back ground and importance of x-ray diffraction giving rise to techniques that even in 2013, remain work horses in laboratories all over the globe.

A search for X-ray polarization in cosmic X-ray sources. [binary X-ray sources and supernovae remnants

NASA Technical Reports Server (NTRS)

Hughes, J. P.; Long, K. S.; Novick, R.

1983-01-01

Fifteen strong X-ray sources were observed by the X-ray polarimeters on board the OSO-8 satellite from 1975 to 1978. The final results of this search for X-ray polarization in cosmic sources are presented in the form of upper limits for the ten sources which are discussed elsewhere. These limits in all cases are consistent with a thermal origin for the X-ray emission.

X-Ray Emission from the Soft X-Ray Transient Aquila X-1

NASA Technical Reports Server (NTRS)

Tavani, Marco

1998-01-01

Aquila X-1 is the most prolific of soft X-ray transients. It is believed to contain a rapidly spinning neutron star sporadically accreting near the Eddington limit from a low-mass companion star. The interest in studying the repeated X-ray outbursts from Aquila X-1 is twofold: (1) studying the relation between optical, soft and hard X-ray emission during the outburst onset, development and decay; (2) relating the spectral component to thermal and non-thermal processes occurring near the magnetosphere and in the boundary layer of a time-variable accretion disk. Our investigation is based on the BATSE monitoring of Aquila X-1 performed by our group. We observed Aquila X-1 in 1997 and re-analyzed archival information obtained in April 1994 during a period of extraordinary outbursting activity of the source in the hard X-ray range. Our results allow, for the first time for this important source, to obtain simultaneous spectral information from 2 keV to 200 keV. A black body (T = 0.8 keV) plus a broken power-law spectrum describe accurately the 1994 spectrum. Substantial hard X-ray emission is evident in the data, confirming that the accretion phase during sub-Eddington limit episodes is capable of producing energetic hard emission near 5 x 10(exp 35) ergs(exp -1). A preliminary paper summarizes our results, and a more comprehensive account is being written. We performed a theoretical analysis of possible emission mechanisms, and confirmed that a non-thermal emission mechanism triggered in a highly sheared magnetosphere at the accretion disk inner boundary can explain the hard X-ray emission. An anticorrelation between soft and hard X-ray emission is indeed prominently observed as predicted by this model.

Characterization of the infrared/X-ray subsecond variability for the black hole transient GX 339-4

NASA Astrophysics Data System (ADS)

Vincentelli, F. M.; Casella, P.; Maccarone, T. J.; Uttley, P.; Gandhi, P.; Belloni, T.; De Marco, B.; Russell, D. M.; Stella, L.; O'Brien, K.

2018-07-01

We present a detailed analysis of the X-ray/IR fast variability of the Black-Hole Transient GX 339-4 during its low/hard state in 2008 August. Thanks to simultaneous high time resolution observations made with the VLT and RXTE, we performed the first characterization of the subsecond variability in the near-infrared band - and of its correlation with the X-rays - for a low-mass X-ray binary, using both time- and frequency-domain techniques. We found a power-law correlation between the X-ray and infrared fluxes when measured on time-scales of 16 s, with a marginally variable slope, steeper than the one found on time-scales of days at similar flux levels. We suggest the variable slope - if confirmed - could be due to the infrared flux being a non-constant combination of both optically thin and optically thick synchrotron emission from the jet, as a result of a variable self-absorption break. From cross spectral analysis, we found an approximately constant infrared time lag of ≈0.1 s, and a very high coherence of ˜90 per cent on time-scales of tens of seconds, slowly decreasing towards higher frequencies. Finally, we report on the first detection of a linear rms-flux relation in the emission from a low-mass X-ray binary jet, on time-scales where little correlation is found between the X-rays and the jet emission itself. This suggests that either the inflow variations and jet IR emission are coupled by a non-linear or time-variable transform, or that the IR rms-flux relation is not transferred from the inflow to the jet, but is an intrinsic property of emission processes in the jet.

"X-Ray Transients in Star-Forming Regions" and "Hard X-Ray Emission from X-Ray Bursters"

NASA Technical Reports Server (NTRS)

Halpern, Jules P.; Kaaret, Philip

1999-01-01

This grant funded work on the analysis of data obtained with the Burst and Transient Experiment (BATSE) on the Compton Gamma-Ray Observatory. The goal of the work was to search for hard x-ray transients in star forming regions using the all-sky hard x-ray monitoring capability of BATSE. Our initial work lead to the discovery of a hard x-ray transient, GRO J1849-03. Follow-up observations of this source made with the Wide Field Camera on BeppoSAX showed that the source should be identified with the previously known x-ray pulsar GS 1843-02 which itself is identified with the x-ray source X1845-024 originally discovered with the SAS-3 satellite. Our identification of the source and measurement of the outburst recurrence time, lead to the identification of the source as a Be/X-ray binary with a spin period of 94.8 s and an orbital period of 241 days. The funding was used primarily for partial salary and travel support for John Tomsick, then a graduate student at Columbia University. John Tomsick, now Dr. Tomsick, received his Ph.D. from Columbia University in July 1999, based partially on results obtained under this investigation. He is now a postdoctoral research scientist at the University of California, San Diego.

Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens

DOE PAGES

Huang, Xiaojing; Conley, Raymond; Bouet, Nathalie; ...

2015-05-04

We report on the fabrication and the characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The lens was fabricated using a sputtering deposition technique, in which a specially designed mask was employed to introduce a thickness gradient in the lateral direction of the multilayer. X-ray characterization shows an efficiency of 27% and a focus size of 26 nm at 14.6 keV, in a good agreement with theoretical calculations. These results indicate that the desired wedging is achieved in the fabricated structure. We anticipate that continuous development on wedged MLLs will advance x-ray nanofocusing optics to new frontiers andmore » enrich capabilities and opportunities for hard X-ray microscopy.« less

Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens

DOE Office of Scientific and Technical Information (OSTI.GOV)

Huang, Xiaojing; Conley, Raymond; Bouet, Nathalie

We report on the fabrication and the characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The lens was fabricated using a sputtering deposition technique, in which a specially designed mask was employed to introduce a thickness gradient in the lateral direction of the multilayer. X-ray characterization shows an efficiency of 27% and a focus size of 26 nm at 14.6 keV, in a good agreement with theoretical calculations. These results indicate that the desired wedging is achieved in the fabricated structure. We anticipate that continuous development on wedged MLLs will advance x-ray nanofocusing optics to new frontiers andmore » enrich capabilities and opportunities for hard X-ray microscopy.« less

Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

DOE Office of Scientific and Technical Information (OSTI.GOV)

Huang, Xian-Rong; Gog, Thomas; Kim, Jungho

Quartz has hundreds of strong Bragg reflections that may offer a great number of choices for making fixed-angle X-ray analyzers and polarizers at virtually any hard X-ray energies with selectable resolution. However, quartz crystals, unlike silicon and germanium, are chiral and may thus appear in two different forms of handedness that are mirror images. Furthermore, because of the threefold rotational symmetry along thecaxis, the {h 1h 2h 3L} and {h 2h 1h 3L} Bragg reflections may have quite different Darwin bandwidth, reflectivity and angular acceptance, although they have the same Bragg angle. The design of X-ray optics from quartz crystalsmore » therefore requires unambiguous determination of the orientation, handedness and polarity of the crystals. The Laue method and single-axis diffraction technique can provide such information, but the variety of conventions used in the literature to describe quartz structures has caused widespread confusion. The current studies give detailed guidelines for design and fabrication of quartz X-ray optics, with special emphasis on the correct interpretation of Laue patterns in terms of the crystallography and diffraction properties of quartz. Meanwhile, the quartz crystals examined were confirmed by X-ray topography to have acceptably low densities of dislocations and other defects, which is the foundation for developing high-resolution quartz-based X-ray optics.« less

NuSTAR Hard X-Ray Survey of the Galactic Center Region I: Hard X-Ray Morphology and Spectroscopy of the Diffuse Emission

NASA Astrophysics Data System (ADS)

Mori, Kaya; Hailey, Charles J.; Krivonos, Roman; Hong, Jaesub; Ponti, Gabriele; Bauer, Franz; Perez, Kerstin; Nynka, Melania; Zhang, Shuo; Tomsick, John A.; Alexander, David M.; Baganoff, Frederick K.; Barret, Didier; Barrière, Nicolas; Boggs, Steven E.; Canipe, Alicia M.; Christensen, Finn E.; Craig, William W.; Forster, Karl; Giommi, Paolo; Grefenstette, Brian W.; Grindlay, Jonathan E.; Harrison, Fiona A.; Hornstrup, Allan; Kitaguchi, Takao; Koglin, Jason E.; Luu, Vy; Madsen, Kristen K.; Mao, Peter H.; Miyasaka, Hiromasa; Perri, Matteo; Pivovaroff, Michael J.; Puccetti, Simonetta; Rana, Vikram; Stern, Daniel; Westergaard, Niels J.; Zhang, William W.; Zoglauer, Andreas

2015-12-01

We present the first sub-arcminute images of the Galactic Center above 10 keV, obtained with NuSTAR. NuSTAR resolves the hard X-ray source IGR J17456-2901 into non-thermal X-ray filaments, molecular clouds, point sources, and a previously unknown central component of hard X-ray emission (CHXE). NuSTAR detects four non-thermal X-ray filaments, extending the detection of their power-law spectra with Γ ˜ 1.3-2.3 up to ˜50 keV. A morphological and spectral study of the filaments suggests that their origin may be heterogeneous, where previous studies suggested a common origin in young pulsar wind nebulae (PWNe). NuSTAR detects non-thermal X-ray continuum emission spatially correlated with the 6.4 keV Fe Kα fluorescence line emission associated with two Sgr A molecular clouds: MC1 and the Bridge. Broadband X-ray spectral analysis with a Monte-Carlo based X-ray reflection model self-consistently determined their intrinsic column density (˜1023 cm-2), primary X-ray spectra (power-laws with Γ ˜ 2) and set a lower limit of the X-ray luminosity of Sgr A* flare illuminating the Sgr A clouds to LX ≳ 1038 erg s-1. Above ˜20 keV, hard X-ray emission in the central 10 pc region around Sgr A* consists of the candidate PWN G359.95-0.04 and the CHXE, possibly resulting from an unresolved population of massive CVs with white dwarf masses MWD ˜ 0.9 M⊙. Spectral energy distribution analysis suggests that G359.95-0.04 is likely the hard X-ray counterpart of the ultra-high gamma-ray source HESS J1745-290, strongly favoring a leptonic origin of the GC TeV emission.

Grid-enhanced X-ray coded aperture microscopy with polycapillary optics

PubMed Central

Sowa, Katarzyna M.; Last, Arndt; Korecki, Paweł

2017-01-01

Polycapillary devices focus X-rays by means of multiple reflections of X-rays in arrays of bent glass capillaries. The size of the focal spot (typically 10–100 μm) limits the resolution of scanning, absorption and phase-contrast X-ray imaging using these devices. At the expense of a moderate resolution, polycapillary elements provide high intensity and are frequently used for X-ray micro-imaging with both synchrotrons and X-ray tubes. Recent studies have shown that the internal microstructure of such an optics can be used as a coded aperture that encodes high-resolution information about objects located inside the focal spot. However, further improvements to this variant of X-ray microscopy will require the challenging fabrication of tailored devices with a well-defined capillary microstructure. Here, we show that submicron coded aperture microscopy can be realized using a periodic grid that is placed at the output surface of a polycapillary optics. Grid-enhanced X-ray coded aperture microscopy with polycapillary optics does not rely on the specific microstructure of the optics but rather takes advantage only of its focusing properties. Hence, submicron X-ray imaging can be realized with standard polycapillary devices and existing set-ups for micro X-ray fluorescence spectroscopy. PMID:28322316

Grid-enhanced X-ray coded aperture microscopy with polycapillary optics.

PubMed

Sowa, Katarzyna M; Last, Arndt; Korecki, Paweł

2017-03-21

Polycapillary devices focus X-rays by means of multiple reflections of X-rays in arrays of bent glass capillaries. The size of the focal spot (typically 10-100 μm) limits the resolution of scanning, absorption and phase-contrast X-ray imaging using these devices. At the expense of a moderate resolution, polycapillary elements provide high intensity and are frequently used for X-ray micro-imaging with both synchrotrons and X-ray tubes. Recent studies have shown that the internal microstructure of such an optics can be used as a coded aperture that encodes high-resolution information about objects located inside the focal spot. However, further improvements to this variant of X-ray microscopy will require the challenging fabrication of tailored devices with a well-defined capillary microstructure. Here, we show that submicron coded aperture microscopy can be realized using a periodic grid that is placed at the output surface of a polycapillary optics. Grid-enhanced X-ray coded aperture microscopy with polycapillary optics does not rely on the specific microstructure of the optics but rather takes advantage only of its focusing properties. Hence, submicron X-ray imaging can be realized with standard polycapillary devices and existing set-ups for micro X-ray fluorescence spectroscopy.

Lumbosacral spine x-ray