Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence

NASA Astrophysics Data System (ADS)

Wu, Meiyi; Burcklen, Catherine; André, Jean-Michel; Guen, Karine Le; Giglia, Angelo; Koshmak, Konstantin; Nannarone, Stefano; Bridou, Françoise; Meltchakov, Evgueni; Rossi, Sébastien de; Delmotte, Franck; Jonnard, Philippe

2017-11-01

We study Cr/Sc-based multilayer mirrors designed to work in the water window range using hard and soft x-ray reflectivity as well as x-ray fluorescence enhanced by standing waves. Samples differ by the elemental composition of the stack, the thickness of each layer, and the order of deposition. This paper mainly consists of two parts. In the first part, the optical performances of different Cr/Sc-based multilayers are reported, and in the second part, we extend further the characterization of the structural parameters of the multilayers, which can be extracted by comparing the experimental data with simulations. The methodology is detailed in the case of Cr/B4C/Sc sample for which a three-layer model is used. Structural parameters determined by fitting reflectivity curve are then introduced as fixed parameters to plot the x-ray standing wave curve, to compare with the experiment, and confirm the determined structure of the stack.

Cr/B 4C multilayer mirrors: Study of interfaces and X-ray reflectance

DOE PAGES

Burcklen, C.; Soufli, R.; Gullikson, E.; ...

2016-03-24

Here, we present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B 4C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B 4C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L 2,3 absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulatedmore » refractive index (optical constants) values for Cr.« less

Reflectivity around the gold L-edges of x-ray reflector of the soft x-ray telescope onboard ASTRO-H

NASA Astrophysics Data System (ADS)

Maeda, Yoshitomo; Kikuchi, Naomichi; Kurashima, Sho; Ishida, Manabu; Iizuka, Ryo; Hayashi, Takayuki; Okajima, Takashi; Matsumoto, Hironori; Mitsuishi, Ikuyuki; Saji, Shigetaka; Sato, Toshiki; Tachibana, Sasagu; Mori, Hideyuki; Christensen, Finn; Brejnholt, Nicolai; Nitta, Kiyofumi; Uruga, Tomoya

2016-07-01

We report the atomic scattering factor in the 11.2{15.4 keV for the ASTRO-H Soft X-ray Telescope (SXT)9 obtained in the ground based measurements. The large effective area of the SXT covers above 10 keV. In fact, the flight data show the spectra of the celestical objects in the hard X-ray band. In order to model the area, the reflectivity measurements in the 11.2{15.4 keV band with the energy pitch of 0.4 { 0.7 eV were made in the synchrotron beamline Spring-8 BL01B1. We obtained atomic scattering factors f1 and f2 by the curve fitting to the reflectivities of our witness sample. The edges associated with the gold's L-I, II, and III transitions are identified, of which the depths are found to be roughly 60% shallower than those expected from the Henke's atomic scattering factor.

Reflectivity Around the Gold L-Edges of X-Ray Reflector of the Soft X-Ray Telescope Onboard ASTRO-H

NASA Technical Reports Server (NTRS)

Maeda, Yoshitomo; Kikuchi, Naomichi; Kurashima, Sho; Ishida, Manabu; Iizuka, Ryo; Hayashi, Takayuki; Okajima, Takashi; Matsumoto, Hironori; Mitsuishi, Ikuyuki; Saji, Shigetaka;

Anomalous X-Ray Reflectivity Characterization of Ion Distribution at Biomimetic Membranes

NASA Astrophysics Data System (ADS)

Vaknin, David; Krüger, Peter; Lösche, Mathias

2003-05-01

Anomalous x-ray reflectivity measurements provides detailed information on ion binding to biomembrane surfaces. Using a monochromatic beam tuned to various x-ray energies at the Argonne National Laboratory Advanced Photon Source and utilizing a newly commissioned x-ray liquid surfaces reflectometer, measurements at and away from ion absorption edges allow determination of the distribution of these ions as they accumulate near lipid membranes. As a model, the interaction of Ba2+ ions with DMPA- (1,2-dimyristoyl-sn-glycero-3-phosphatidic acid) monolayers at the aqueous surface is studied. We find an unexpectedly large concentration of barium at the interface, ≈1.5 per DMPA-, forming a Stern layer of bound ions and a cloud of less densely bound ions near the lipid headgroups. This result can be understood only if one assumes that bound cations are partially speciated, e.g., as BaOH+.

Optical and x-ray alignment approaches for off-plane reflection gratings

NASA Astrophysics Data System (ADS)

Allured, Ryan; Donovan, Benjamin D.; DeRoo, Casey T.; Marlowe, Hannah R.; McEntaffer, Randall L.; Tutt, James H.; Cheimets, Peter N.; Hertz, Edward; Smith, Randall K.; Burwitz, Vadim; Hartner, Gisela; Menz, Benedikt

2015-09-01

Off-plane reflection gratings offer the potential for high-resolution, high-throughput X-ray spectroscopy on future missions. Typically, the gratings are placed in the path of a converging beam from an X-ray telescope. In the off-plane reflection grating case, these gratings must be co-aligned such that their diffracted spectra overlap at the focal plane. Misalignments degrade spectral resolution and effective area. In-situ X-ray alignment of a pair of off-plane reflection gratings in the path of a silicon pore optics module has been performed at the MPE PANTER beamline in Germany. However, in-situ X-ray alignment may not be feasible when assembling all of the gratings required for a satellite mission. In that event, optical methods must be developed to achieve spectral alignment. We have developed an alignment approach utilizing a Shack-Hartmann wavefront sensor and diffraction of an ultraviolet laser. We are fabricating the necessary hardware, and will be taking a prototype grating module to an X-ray beamline for performance testing following assembly and alignment.

Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions☆

PubMed Central

Ingerle, D.; Meirer, F.; Pepponi, G.; Demenev, E.; Giubertoni, D.; Wobrauschek, P.; Streli, C.

2014-01-01

The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

Depth resolved compositional analysis of aluminium oxide thin film using non-destructive soft x-ray reflectivity technique

NASA Astrophysics Data System (ADS)

Sinha, Mangalika; Modi, Mohammed H.

2017-10-01

In-depth compositional analysis of 240 Å thick aluminium oxide thin film has been carried out using soft x-ray reflectivity (SXR) and x-ray photoelectron spectroscopy technique (XPS). The compositional details of the film is estimated by modelling the optical index profile obtained from the SXR measurements over 60-200 Å wavelength region. The SXR measurements are carried out at Indus-1 reflectivity beamline. The method suggests that the principal film region is comprised of Al2O3 and AlOx (x = 1.6) phases whereas the interface region comprised of SiO2 and AlOx (x = 1.6) mixture. The soft x-ray reflectivity technique combined with XPS measurements explains the compositional details of principal layer. Since the interface region cannot be analyzed with the XPS technique in a non-destructive manner in such a case the SXR technique is a powerful tool for nondestructive compositional analysis of interface region.

X-ray Timing Measurements

NASA Technical Reports Server (NTRS)

Strohmayer, T.

2008-01-01

We present new, extended X-ray timing measurements of the ultra-compact binary candidates V407 Vul and RX J0806.3+1527 (J0806), as well as a summary of the first high resolution X-ray spectra of 50806 obtained with the Chandra/LETG. The temporal baseline for both objects is approximately 12 years, and our measurements confirm the secular spin-up in their X-ray periods. The spin-up rate in 50806 is remarkably uniform at 3.55x10(exp -16)Hz/s, with a measurement precision of 0.2%. We place a limit (90% confidence) on 1 d dot nu < 4x10(exp -26)Hz/sq s. Interestingly, for V407 Vul we find the first evidence that the spin-up rate is slowing, with d dot\

Hard x-ray characterization of a HEFT single-reflection prototype

NASA Astrophysics Data System (ADS)

Christensen, Finn E.; Craig, William W.; Hailey, Charles J.; Jimenez-Garate, Mario A.; Windt, David L.; Harrison, Fiona A.; Mao, Peter H.; Ziegler, Eric; Honkimaki, Veijo; Sanchez del Rio, Manuel; Freund, Andreas K.; Ohler, M.

2000-07-01

We have measured the hard X-ray reflectivity and imaging performance from depth graded W/Si multilayer coated mirror segments mounted in a single reflection cylindrical prototype for the hard X-ray telescopes to be flown on the High Energy Focusing Telescope (HEFT) balloon mission. Data have been obtained in the energy range from 18 - 170 keV at the European Synchrotron Radiation Facility and at the Danish Space Research Institute at 8 keV. The modeling of the reflectivity data demonstrate that the multilayer structure can be well described by the intended power law distribution of the bilayer thicknesses optimized for the telescope performance and we find that all the data is consistent with an interfacial width of 4.5 angstroms. We have also demonstrated that the required 5% uniformity of the coatings is obtained over the mirror surface and we have shown that it is feasible to use similar W/Si coatings for much higher energies than the nominal energy range of HEFT leading the way for designing Gamma-ray telescopes for future astronomical applications. Finally we have demonstrate 35 arcsecond Half Power Diameter imaging performance of the one bounce prototype throughout the energy range of the HEFT telescopes.

Effect of surface roughness and subsurface damage on grazing-incidence x-ray scattering and specular reflectance.

PubMed

Lodha, G S; Yamashita, K; Kunieda, H; Tawara, Y; Yu, J; Namba, Y; Bennett, J M

1998-08-01

Grazing-incidence specular reflectance and near-specular scattering were measured at Al-K(alpha) (1.486-keV, 8.34-?) radiation on uncoated dielectric substrates whose surface topography had been measured with a scanning probe microscope and a mechanical profiler. Grazing-incidence specular reflectance was also measured on selected substrates at the Cu-K(alpha) (8.047-keV, 1.54-?) wavelength. Substrates included superpolished and conventionally polished fused silica; SiO(2) wafers; superpolished and precision-ground Zerodur; conventionally polished, float-polished, and precision-ground BK-7 glass; and superpolished and precision-ground silicon carbide. Roughnesses derived from x-ray specular reflectance and scattering measurements were in good agreement with topographic roughness values measured with a scanning probe microscope (atomic force microscope) and a mechanical profiler that included similar ranges of surface spatial wavelengths. The specular reflectance was also found to be sensitive to the density of polished surface layers and subsurface damage down to the penetration depth of the x rays. Density gradients and subsurface damage were found in the superpolished fused-silica and precision-ground Zerodur samples. These results suggest that one can nondestructively evaluate subsurface damage in transparent materials using grazing-incidence x-ray specular reflectance in the 1.5-8-keV range.

X-ray rocking curve measurements of bent crystals. [used in High Resolution Spectrometer in Advanced X-ray Astrophysics Facility

NASA Technical Reports Server (NTRS)

Hakim, M. B.; Muney, W. S.; Fowler, W. B.; Woodgate, B. E.

1988-01-01

A three-crystal laboratory X-ray spectrometer is used to measure the Bragg reflection from concave cylindrically curved crystals to be used in the high-resolution X-ray spectrometer of the NASA Advanced X-ray Astrophysics Facility (AXAF). The first two crystals, in the dispersive (1.1) arrangement, select a narrow collimated monochromatic beam in the Cu K-alpha(1) line at 1.5 A (8.1 keV), which illuminates the test crystal. The angular centroids of rocking curves measured along the surface provide a measure of the conformity of the crystal to the desired radius of curvature. Individual and combined rocking-curve widths and areas provide a measure of the resolution and efficiency at 1.54 A. The crystals analyzed included LiF(200), PET, and acid phthalates such as TAP.

Airborne particulate matter (PM) filter analysis and modeling by total reflection X-ray fluorescence (TXRF) and X-ray standing wave (XSW).

PubMed

Borgese, L; Salmistraro, M; Gianoncelli, A; Zacco, A; Lucchini, R; Zimmerman, N; Pisani, L; Siviero, G; Depero, L E; Bontempi, E

2012-01-30

This work is presented as an improvement of a recently introduced method for airborne particulate matter (PM) filter analysis [1]. X-ray standing wave (XSW) and total reflection X-ray fluorescence (TXRF) were performed with a new dedicated laboratory instrumentation. The main advantage of performing both XSW and TXRF, is the possibility to distinguish the nature of the sample: if it is a small droplet dry residue, a thin film like or a bulk sample. Another advantage is related to the possibility to select the angle of total reflection to make TXRF measurements. Finally, the possibility to switch the X-ray source allows to measure with more accuracy lighter and heavier elements (with a change in X-ray anode, for example from Mo to Cu). The aim of the present study is to lay the theoretical foundation of the new proposed method for airborne PM filters quantitative analysis improving the accuracy and efficiency of quantification by means of an external standard. The theoretical model presented and discussed demonstrated that airborne PM filters can be considered as thin layers. A set of reference samples is prepared in laboratory and used to obtain a calibration curve. Our results demonstrate that the proposed method for quantitative analysis of air PM filters is affordable and reliable without the necessity to digest filters to obtain quantitative chemical analysis, and that the use of XSW improve the accuracy of TXRF analysis. Copyright © 2011 Elsevier B.V. All rights reserved.

Confocal total reflection X-ray fluorescence technology based on an elliptical monocapillary and a parallel polycapillary X-ray optics.

PubMed

Zhu, Yu; Wang, Yabing; Sun, Tianxi; Sun, Xuepeng; Zhang, Xiaoyun; Liu, Zhiguo; Li, Yufei; Zhang, Fengshou

2018-07-01

A total reflection X-ray fluorescence (TXRF) spectrometer based on an elliptical monocapillary X-ray lens (MXRL) and a parallel polycapillary X-ray lens (PPXRL) was designed. This TXRF instrument has micro focal spot, low divergence and high intensity of incident X-ray beam. The diameter of the focal spot of MXRL was 16.5 µm, and the divergence of the incident X-ray beam was 3.4 mrad. We applied this TXRF instrument to the micro analysis of a single-layer film containing Ni deposited on a Si substrate by metal vapor vacuum arc ion source. Copyright © 2018 Elsevier Ltd. All rights reserved.

NASA's Chandra Finds That Saturn Reflects X-rays From Sun

NASA Astrophysics Data System (ADS)

2005-05-01

When it comes to mysterious X-rays from Saturn, the ringed planet may act as a mirror, reflecting explosive activity from the sun, according to scientists using NASA's Chandra X-ray Observatory. The findings stem from the first observation of an X-ray flare reflected from Saturn's low-latitudes - the region that correlates to Earth's equator and tropics. Led by Dr. Anil Bhardwaj, a planetary scientist at NASA's Marshall Space Flight Center (MSFC) in Huntsville, Ala., the study revealed that Saturn acts as a diffuse mirror for solar X-rays. Counting photons - particles that carry electromagnetic energy including X-rays - was critical to this discovery. For every few thousand X-ray photons Saturn receives from the sun, it reflects a single X-ray photon back. Previous studies revealed that Jupiter, with a diameter 11 times that of Earth, behaves in a similar fashion. Saturn is about 9.5 times as big as Earth, but is twice as far from Earth as Jupiter. "The bigger the planet and nearer to the Sun, the more solar photons it will intercept - resulting in more reflected X-rays," said Bhardwaj. "These results imply we could use giant planets like Jupiter and Saturn as remote-sensing tools. By reflecting solar activity back to us, they could help us monitor X-ray flaring on portions of the sun facing away from Earth's space satellites." Massive solar explosions called flares often accompany coronal mass ejections, which emit solar material and magnetic field. When directed toward the Earth, these ejections can wreak havoc on communication systems from cell phones to satellites. Even as the research appears to have solved one mystery - the source of Saturn's X-rays, it fueled longstanding questions about magnetic fields. Earth's magnetic field is the reason compasses work, since the field acts like a huge bar magnet, causing the magnetic north pole of a compass to point to the magnetic south pole of the Earth. In addition, migratory birds seem to sense the magnetic field

Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

DOE Office of Scientific and Technical Information (OSTI.GOV)

Singh, Surendra, E-mail: surendra@barc.gov.in; Basu, Saibal

2016-05-23

X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependentmore » structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.« less

Surface layering and melting in an ionic liquid studied by resonant soft X-ray reflectivity

PubMed Central

Mezger, Markus; Ocko, Benjamin M.; Reichert, Harald; Deutsch, Moshe

2013-01-01

The molecular-scale structure of the ionic liquid [C18mim]+[FAP]− near its free surface was studied by complementary methods. X-ray absorption spectroscopy and resonant soft X-ray reflectivity revealed a depth-decaying near-surface layering. Element-specific interfacial profiles were extracted with submolecular resolution from energy-dependent soft X-ray reflectivity data. Temperature-dependent hard X-ray reflectivity, small- and wide-angle X-ray scattering, and infrared spectroscopy uncovered an intriguing melting mechanism for the layered region, where alkyl chain melting drove a negative thermal expansion of the surface layer spacing. PMID:23431181

Relativistic Effects on Reflection X-ray Spectra of AGN

DOE Office of Scientific and Technical Information (OSTI.GOV)

Lee, Khee-Gan; /University Coll. London; Fuerst, Steven V.

2007-01-05

We have calculated the reflection component of the X-ray spectra of active galactic nuclei (AGN) and shown that they can be significantly modified by the relativistic motion of the accretion flow and various gravitational effects of the central black hole. The absorption edges in the reflection spectra suffer severe energy shifts and smearing. The degree of distortion depends on the system parameters, and the dependence is stronger for some parameters such as the inner radius of the accretion disk and the disk viewing inclination angles. The relativistic effects are significant and are observable. Improper treatment of the reflection component ofmore » the X-ray continuum in spectral fittings will give rise to spurious line-like features, which will mimic the fluorescent emission lines and mask the relativistic signatures of the lines.« less

Characterization of ion beam sputtered deposited W/Si multilayers by grazing incidence x-ray diffraction and x-ray reflectivity technique

DOE Office of Scientific and Technical Information (OSTI.GOV)

Dhawan, Rajnish, E-mail: rajnish@rrcat.gov.in; Rai, Sanjay

2016-05-23

W/Si multilayers four samples have been deposited on silicon substrate using ion beam sputtering system. Thickness of tungsten (W) varies from around 10 Å to 40 Å while the silicon (Si) thickness remains constant at around 30 Å in multilayers [W-Si]{sub x4}. The samples have been characterized by grazing incidence X-ray diffraction (GIXRD) and X-ray reflectivity technique (XRR). GIXRD study shows the crystalline behaviour of W/Si multilayer by varying W thickness and it is found that above 20 Å the W film transform from amorphous to crystalline phase and X-ray reflectivity data shows that the roughnesses of W increases onmore » increasing the W thicknesses in W/Si multilayers.« less

Quantitative Measurements of X-ray Intensity

DOE Office of Scientific and Technical Information (OSTI.GOV)

Haugh, M. J., Schneider, M.

This chapter describes the characterization of several X-ray sources and their use in calibrating different types of X-ray cameras at National Security Technologies, LLC (NSTec). The cameras are employed in experimental plasma studies at Lawrence Livermore National Laboratory (LLNL), including the National Ignition Facility (NIF). The sources provide X-rays in the energy range from several hundred eV to 110 keV. The key to this effort is measuring the X-ray beam intensity accurately and traceable to international standards. This is accomplished using photodiodes of several types that are calibrated using radioactive sources and a synchrotron source using methods and materials thatmore » are traceable to the U.S. National Institute of Standards and Technology (NIST). The accreditation procedures are described. The chapter begins with an introduction to the fundamental concepts of X-ray physics. The types of X-ray sources that are used for device calibration are described. The next section describes the photodiode types that are used for measuring X-ray intensity: power measuring photodiodes, energy dispersive photodiodes, and cameras comprising photodiodes as pixel elements. Following their description, the methods used to calibrate the primary detectors, the power measuring photodiodes and the energy dispersive photodiodes, as well as the method used to get traceability to international standards are described. The X-ray source beams can then be measured using the primary detectors. The final section then describes the use of the calibrated X-ray beams to calibrate X-ray cameras. Many of the references are web sites that provide databases, explanations of the data and how it was generated, and data calculations for specific cases. Several general reference books related to the major topics are included. Papers expanding some subjects are cited.« less

Waiting in the Wings: Reflected X-ray Emission from the Homunculus Nebula

NASA Technical Reports Server (NTRS)

Corcoran, M. F.; Hamaguchi, K.; Gull, T.; Davidson, K.; Petre, R.; Hillier, D. J.; Smith, N.; Damineli, A.; Morse, J. A.; Walborn, N. R.

2004-01-01

We report the first detection of X-ray emission associated with the Homunculus Nebula which surrounds the supermassive star eta Carinae. The emission is characterized by a temperature in excess of 100 MK, and is consistent with scattering of the time-delayed X-ray flux associated with the star. The nebular emission is bright in the northwestern lobe and near the central regions of the Homunculus, and fainter in the southeastern lobe. We also report the detection of an unusually broad Fe K fluorescent line, which may indicate fluorescent scattering off the wind of a companion star or some other high velocity outflow. The X-ray Homunculus is the nearest member of the small class of Galactic X-ray reflection nebulae, and the only one in which both the emitting and reflecting sources are distinguishable.

Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

NASA Astrophysics Data System (ADS)

Streli, C.; Pepponi, G.; Wobrauschek, P.; Jokubonis, C.; Falkenberg, G.; Záray, G.; Broekaert, J.; Fittschen, U.; Peschel, B.

2006-11-01

At the Hamburger Synchrotronstrahlungslabor (HASYLAB), Beamline L, a vacuum chamber for synchrotron radiation-induced total reflection X-ray fluorescence analysis, is now available which can easily be installed using the adjustment components for microanalysis present at this beamline. The detector is now in the final version of a Vortex silicon drift detector with 50-mm 2 active area from Radiant Detector Technologies. With the Ni/C multilayer monochromator set to 17 keV extrapolated detection limits of 8 fg were obtained using the 50-mm 2 silicon drift detector with 1000 s live time on a sample containing 100 pg of Ni. Various applications are presented, especially of samples which are available in very small amounts: As synchrotron radiation-induced total reflection X-ray fluorescence analysis is much more sensitive than tube-excited total reflection X-ray fluorescence analysis, the sampling time of aerosol samples can be diminished, resulting in a more precise time resolution of atmospheric events. Aerosols, directly sampled on Si reflectors in an impactor were investigated. A further application was the determination of contamination elements in a slurry of high-purity Al 2O 3. No digestion is required; the sample is pipetted and dried before analysis. A comparison with laboratory total reflection X-ray fluorescence analysis showed the higher sensitivity of synchrotron radiation-induced total reflection X-ray fluorescence analysis, more contamination elements could be detected. Using the Si-111 crystal monochromator also available at beamline L, XANES measurements to determine the chemical state were performed. This is only possible with lower sensitivity as the flux transmitted by the crystal monochromator is about a factor of 100 lower than that transmitted by the multilayer monochromator. Preliminary results of X-ray absorption near-edge structure measurements for As in xylem sap from cucumber plants fed with As(III) and As(V) are reported. Detection limits

X-ray microscopy using reflection targets based on SEM with tungsten filament

NASA Astrophysics Data System (ADS)

Liu, Junbiao; Ma, Yutian; Zhao, Weixia; Niu, Geng; Chu, Mingzhang; Yin, Bohua; Han, Li; Liu, Baodong

2016-10-01

X-ray MicroandNano imaging is developed based on the conventional x-ray tomography, it can not only provide nondestructive testing with higher resolution measurement, but also be used to examine the material or the structure with low atomic number and low density. The source with micro-focal spot size is one of the key components of x-ray MicroandNano imaging. The focused electron beam from SEM bombarding the metal target can generate x-ray with ultra-small size. It is convenient to set up x-ray microscopy based on SEM for laboratory use. This paper describes a new x-ray microscopy using reflection targets based on FEI Quanta600 SEM with tungsten filament. The flat panel detector is placed outside of the vacuum chamber with 300μm thickness Be-window to isolate vacuum from the air. A stage with 3 DOFs is added to adjust the positions of the target, the SEM's sample stage is used to move sample. And the shape of target is designed as cone with 60° half cone angle to get the maximum x-ray dosage. The attenuation coefficient of Bewindow for x-ray is about 25%. Finally, the line pair card is used to evaluate the resolution and the result shows that the resolution of the system can receive less than 750nm, when the acceleration voltage is 30keV, the beam current is 160nA, the SEM working distance is 5mm and the acquisition time of the detector is 60s.

In situ X-ray measurements of MOVPE growth of InxGa1-xN single quantum wells

NASA Astrophysics Data System (ADS)

Ju, Guangxu; Fuchi, Shingo; Tabuchi, Masao; Takeda, Yoshikazu

2013-05-01

GaN/InxGa1-xN/GaN single quantum wells (SQWs) have been grown on c-plane GaN/sapphire substrates using MOVPE system. PL (photoluminescence) and AFM (atomic force microscope) measurements demonstrate good quality of after-growth thermal-annealed SQWs. In situ XRD (X-ray diffraction), XRR (X-ray reflectivity), and X-ray CTR (crystal truncation rod) scattering measurements were successfully conducted on the SQWs under the NH3+N2 ambient at 1103 K. The analysis results of the XRR and the X-ray CTR spectra at 1103 K and at 300 K on the same sample matched well. It demonstrated that In0.09Ga0.91N SQW structure with several ML (monolayer) InGaN thicknesses was successfully investigated using the XRR and CTR scattering measurements at 1103 K.

The approach to reflection x-ray microscopy below the critical angles

NASA Astrophysics Data System (ADS)

Artyukov, Igor A.; Busarov, Alexander; Popov, Nikolay L.; Vinogradov, Alexander V.

2017-05-01

There is a quest for new knowledge and methods to study various materials and processes on surfaces and interfaces at the nanoscale. It concerns ablation, phase transitions, physical and chemical transformations, dissolution, selforganization etc. Obviously, to achieve an appropriate resolution it is necessary to use a corresponding wavelength . Higher resolution can be obtained with shorter wavelengths. On the other hand, in surface modification, ablation, study of buried interfaces etc. the penetration length of radiation into the materials, which depends on the wavelength and angle of incidence, plays important role... Considering these factors the experimental studies in nano-physics and nanotechnology are usually carried out using X-ray radiation with a photon energy of 0.1-10 keV. As far as surfaces and films are investigated, it is reasonable to use an X-ray microscope operating in the reflection mode. However, in this spectral range a substantial portion of the radiation is reflected only at small grazing angles (e.g. <= 10°). Thus, the idea of grazing incidence reflection-mode X-ray microscope has been developed. In this paper, we consider one of possible schemes of such an X-ray microscope. Our analysis and simulation is based on the extension of the Fresnel propagation theory to tilted object problems.

Recent X-ray hybrid CMOS detector developments and measurements

NASA Astrophysics Data System (ADS)

Hull, Samuel V.; Falcone, Abraham D.; Burrows, David N.; Wages, Mitchell; Chattopadhyay, Tanmoy; McQuaide, Maria; Bray, Evan; Kern, Matthew

2017-08-01

The Penn State X-ray detector lab, in collaboration with Teledyne Imaging Sensors (TIS), have progressed their efforts to improve soft X-ray Hybrid CMOS detector (HCD) technology on multiple fronts. Having newly acquired a Teledyne cryogenic SIDECARTM ASIC for use with HxRG devices, measurements were performed with an H2RG HCD and the cooled SIDECARTM. We report new energy resolution and read noise measurements, which show a significant improvement over room temperature SIDECARTM operation. Further, in order to meet the demands of future high-throughput and high spatial resolution X-ray observatories, detectors with fast readout and small pixel sizes are being developed. We report on characteristics of new X-ray HCDs with 12.5 micron pitch that include in-pixel CDS circuitry and crosstalk-eliminating CTIA amplifiers. In addition, PSU and TIS are developing a new large-scale array Speedster-EXD device. The original 64 × 64 pixel Speedster-EXD prototype used comparators in each pixel to enable event driven readout with order of magnitude higher effective readout rates, which will now be implemented in a 550 × 550 pixel device. Finally, the detector lab is involved in a sounding rocket mission that is slated to fly in 2018 with an off-plane reflection grating array and an H2RG X-ray HCD. We report on the planned detector configuration for this mission, which will increase the NASA technology readiness level of X-ray HCDs to TRL 9.

Modeling multilayer x-ray reflectivity using genetic algorithms

NASA Astrophysics Data System (ADS)

Sánchez del Río, M.; Pareschi, G.; Michetschläger, C.

2000-06-01

The x-ray reflectivity of a multilayer is a non-linear function of many parameters (materials, layer thickness, density, roughness). Non-linear fitting of experimental data with simulations requires the use of initial values sufficiently close to the optimum value. This is a difficult task when the topology of the space of the variables is highly structured. We apply global optimization methods to fit multilayer reflectivity. Genetic algorithms are stochastic methods based on the model of natural evolution: the improvement of a population along successive generations. A complete set of initial parameters constitutes an individual. The population is a collection of individuals. Each generation is built from the parent generation by applying some operators (selection, crossover, mutation, etc.) on the members of the parent generation. The pressure of selection drives the population to include "good" individuals. For large number of generations, the best individuals will approximate the optimum parameters. Some results on fitting experimental hard x-ray reflectivity data for Ni/C and W/Si multilayers using genetic algorithms are presented. This method can also be applied to design multilayers optimized for a target application.

Compact X-ray sources: X-rays from self-reflection

NASA Astrophysics Data System (ADS)

Mangles, Stuart P. D.

2012-05-01

Laser-based particle acceleration offers a way to reduce the size of hard-X-ray sources. Scientists have now developed a simple scheme that produces a bright flash of hard X-rays by using a single laser pulse both to generate and to scatter an electron beam.

Reflectivity Around the Gold M-Edges of X-ray Reflector of the Soft X-Ray Telescope Onboard ASTRO-H

NASA Technical Reports Server (NTRS)

Kurashimaa, Sho; Furuzawa, Akihiro; Sato, Toshiki; Kikuchia, Naomichi; Nakaniwaa, Nozomi; Maeda, Yoshitomo; Ishida, Manabu; Izuka, Ryo; Okajima, Takashi; Mori, Hideyuki;

Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors.

PubMed

Xu, Dechao; Huang, Qiushi; Wang, Yiwen; Li, Pin; Wen, Mingwu; Jonnard, Philippe; Giglia, Angelo; Kozhevnikov, Igor V; Wang, Kun; Zhang, Zhong; Wang, Zhanshan

2015-12-28

Pd/Y multilayer mirrors operating in the soft X-ray region are characterized by a high theoretical reflectance, reaching 65% at normal incidence in the 8-12 nm wavelength range. However, a severe intermixing of neighboring Pd and Y layers results in an almost total disappearance of the interfaces inside the multilayer structures fabricated by direct current magnetron sputtering and thus a dramatic reflectivity decrease. Based on grazing incidence X-ray reflectometry and X-ray photoelectron spectroscopy, we demonstrate that the stability of the interfaces in Pd/Y multilayer structures can be essentially improved by adding a small amount of nitrogen (4-8%) to the working gas (Ar). High resolution transmission electron microscopy shows that the interlayer width is only 0.9 nm and 0.6 nm for Y(N)-on-Pd(N) and Pd(N)-on-Y(N) interfaces, respectively. A well-defined crystalline texture of YN (200) is observed on the electron diffraction pattern. As a result, the measured reflectance of the Pd(N)/Y(N) multilayer achieves 30% at λ = 9.3 nm. The peak reflectivity value is limited by the remaining interlayers and the formation of the YN compound inside the yttrium layers, resulting in an increased absorption.

A mirror for lab-based quasi-monochromatic parallel x-rays

NASA Astrophysics Data System (ADS)

Nguyen, Thanhhai; Lu, Xun; Lee, Chang Jun; Jung, Jin-Ho; Jin, Gye-Hwan; Kim, Sung Youb; Jeon, Insu

2014-09-01

A multilayered parabolic mirror with six W/Al bilayers was designed and fabricated to generate monochromatic parallel x-rays using a lab-based x-ray source. Using this mirror, curved bright bands were obtained in x-ray images as reflected x-rays. The parallelism of the reflected x-rays was investigated using the shape of the bands. The intensity and monochromatic characteristics of the reflected x-rays were evaluated through measurements of the x-ray spectra in the band. High intensity, nearly monochromatic, and parallel x-rays, which can be used for high resolution x-ray microscopes and local radiation therapy systems, were obtained.

Rise time measurement for ultrafast X-ray pulses

DOEpatents

Celliers, Peter M [Berkeley, CA; Weber, Franz A [Oakland, CA; Moon, Stephen J [Tracy, CA

2005-04-05

A pump-probe scheme measures the rise time of ultrafast x-ray pulses. Conventional high speed x-ray diagnostics (x-ray streak cameras, PIN diodes, diamond PCD devices) do not provide sufficient time resolution to resolve rise times of x-ray pulses on the order of 50 fs or less as they are being produced by modern fast x-ray sources. Here, we are describing a pump-probe technique that can be employed to measure events where detector resolution is insufficient to resolve the event. The scheme utilizes a diamond plate as an x-ray transducer and a p-polarized probe beam.

Rise Time Measurement for Ultrafast X-Ray Pulses

DOEpatents

Celliers, Peter M.; Weber, Franz A.; Moon, Stephen J.

2005-04-05

A pump-probe scheme measures the rise time of ultrafast x-ray pulses. Conventional high speed x-ray diagnostics (x-ray streak cameras, PIN diodes, diamond PCD devices) do not provide sufficient time resolution to resolve rise times of x-ray pulses on the order of 50 fs or less as they are being produced by modern fast x-ray sources. Here, we are describing a pump-probe technique that can be employed to measure events where detector resolution is insufficient to resolve the event. The scheme utilizes a diamond plate as an x-ray transducer and a p-polarized probe beam.

Quantitative disentanglement of coherent and incoherent laser-induced surface deformations by time-resolved x-ray reflectivity

NASA Astrophysics Data System (ADS)

Sander, M.; Pudell, J.-E.; Herzog, M.; Bargheer, M.; Bauer, R.; Besse, V.; Temnov, V.; Gaal, P.

2017-12-01

We present time-resolved x-ray reflectivity measurements on laser excited coherent and incoherent surface deformations of thin metallic films. Based on a kinematical diffraction model, we derive the surface amplitude from the diffracted x-ray intensity and resolve transient surface excursions with sub-Å spatial precision and 70 ps temporal resolution. The analysis allows for decomposition of the surface amplitude into multiple coherent acoustic modes and a substantial contribution from incoherent phonons which constitute the sample heating.

In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity

DOE PAGES

Cao, Chuntian; Steinrück, Hans-Georg; Shyam, Badri; ...

2016-10-26

Surface sensitive X-ray reflectivity (XRR) measurements were performed to investigate the electrochemical lithiation of a native oxide terminated single crystalline silicon (100) electrode in real time during the first galvanostatic discharge cycle. This allows us to gain nanoscale, mechanistic insight into the lithiation of Si and the formation of the solid electrolyte interphase (SEI). We describe an electrochemistry cell specifically designed for in situ XRR studies and have determined the evolution of the electron density profile of the lithiated Si layer (Li xSi) and the SEI layer with subnanometer resolution. We propose a three-stage lithiation mechanism with a reaction limited,more » layer-by-layer lithiation of the Si at the Li xSi/Si interface.« less

X-ray reflection from cold white dwarfs in magnetic cataclysmic variables

NASA Astrophysics Data System (ADS)

Hayashi, Takayuki; Kitaguchi, Takao; Ishida, Manabu

2018-02-01

We model X-ray reflection from white dwarfs (WDs) in magnetic cataclysmic variables (mCVs) using a Monte Carlo simulation. A point source with a power-law spectrum or a realistic post-shock accretion column (PSAC) source irradiates a cool and spherical WD. The PSAC source emits thermal spectra of various temperatures stratified along the column according to the PSAC model. In the point-source simulation, we confirm the following: a source harder and nearer to the WD enhances the reflection; higher iron abundance enhances the equivalent widths (EWs) of fluorescent iron Kα1, 2 lines and their Compton shoulder, and increases the cut-off energy of a Compton hump; significant reflection appears from an area that is more than 90° apart from the position right under the point X-ray source because of the WD curvature. The PSAC simulation reveals the following: a more massive WD basically enhances the intensities of the fluorescent iron Kα1, 2 lines and the Compton hump, except for some specific accretion rate, because the more massive WD makes a hotter PSAC from which higher-energy X-rays are preferentially emitted; a larger specific accretion rate monotonically enhances the reflection because it makes a hotter and shorter PSAC; the intrinsic thermal component hardens by occultation of the cool base of the PSAC by the WD. We quantitatively estimate the influences of the parameters on the EWs and the Compton hump with both types of source. We also calculate X-ray modulation profiles brought about by the WD spin. These depend on the angles of the spin axis from the line of sight and from the PSAC, and on whether the two PSACs can be seen. The reflection spectral model and the modulation model involve the fluorescent lines and the Compton hump and can directly be compared to the data, which allows us to estimate these geometrical parameters with unprecedented accuracy.

Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations

DOE PAGES

Mei, A. B.; Hellman, O.; Schlepuetz, C. M.; ...

2015-11-03

Synchrotron reflection x-ray thermal diffuse scattering (TDS) measurements, rather than previously reported transmission TDS, are carried out at room temperature and analyzed using a formalism based upon second-order interatomic force constants and long-range Coulomb interactions to obtain quantitative determinations of MgO phonon dispersion relations (h) over bar omega(j) (q), phonon densities of states g((h) over bar omega), and isochoric temperature-dependent vibrational heat capacities c v (T). We use MgO as a model system for investigating reflection TDS due to its harmonic behavior as well as its mechanical and dynamic stability. Resulting phonon dispersion relations and densities of states are foundmore » to be in good agreement with independent reports from inelastic neutron and x-ray scattering experiments. Temperature-dependent isochoric heat capacities c v (T), computed within the harmonic approximation from (h) over bar omega(j) (q) values, increase with temperature from 0.4 x 10 -4 eV/atom K at 100 K to 1.4 x 10 -4 eV/atom K at 200 K and 1.9 x 10 -4 eV/atom K at 300 K, in excellent agreement with isobaric heat capacity values c p (T) between 4 and 300 K. We anticipate that the experimental approach developed here will be valuable for determining vibrational properties of heteroepitaxial thin films since the use of grazing-incidence (θ ≲ θ c where θ c is the density-dependent critical angle) allows selective tuning of x-ray penetration depths to ≲ 10 nm.« less

X-ray absorption and reflection as probes of the GaN conduction bands: Theory and experiments

DOE Office of Scientific and Technical Information (OSTI.GOV)

Lambrecht, W.R.L.; Rashkeev, S.N.; Segall, B.

1997-04-01

X-ray absorption measurements are a well-known probe of the unoccupied states in a material. The same information can be obtained by using glancing angle X-ray reflectivity. In spite of several existing band structure calculations of the group III nitrides and previous optical studies in UV range, a direct probe of their conduction band densities of states is of interest. The authors performed a joint experimental and theoretical investigation using both of these experimental techniques for wurtzite GaN.

X-ray beamsplitter

DOEpatents

Ceglio, Natale M.; Stearns, Daniel S.; Hawryluk, Andrew M.; Barbee, Jr., Troy W.

1989-01-01

An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5-50 pairs of alternate Mo/Si layers with a period of 20-250 A. The support membrane is 10-200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window.

Probing interfacial reactions with x-ray reflectivity and x-ray reflection interface microscopy : influence of NaCl on the dissolution of orthoclase at pOH2 and 85 {degree} C.

DOE Office of Scientific and Technical Information (OSTI.GOV)

Fenter, P.; Lee, S. S.; Park, C.

2010-01-01

The role of electrolyte ions in the dissolution of orthoclase (0 0 1) in 0.01 m NaOH (pOH {approx} 2) at 84 {+-} 1 C is studied using a combination of in-situ X-ray reflectivity (XR) and ex-situ X-ray reflection interface microscopy (XRIM). The real-time XR measurements show characteristic intensity oscillations as a function of time indicative of the successive removal of individual layers. The dissolution rate in 0.01 m NaOH increases approximately linearly with increasing NaCl concentration up to 2 m NaCl. XRIM measurements of the lateral interfacial topography/structure were made for unreacted surfaces and those reacted in 0.01 mmore » NaOH/1.0 m NaCl solution for 15, 30 and 58 min. The XRIM images reveal that the dissolution reaction leads to the formation of micron-scale regions that are characterized by intrinsically lower reflectivity than the unreacted regions, and appears to be nucleated at steps and defect sites. The reflectivity signal from these reacted regions in the presence of NaCl in solution is significantly lower than that calculated from an idealized layer-by-layer dissolution process, as observed previously in 0.1 m NaOH in the absence of added electrolyte. This difference suggests that dissolved NaCl results in a higher terrace reactivity leading to a more three-dimensional process, consistent with the real-time XR measurements. These observations demonstrate the feasibility of XRIM to gain new insights into processes that control interfacial reactivity, specifically the role of electrolytes in feldspar dissolution at alkaline conditions.« less

[Technology Development for X-Ray Reflection for the Constellation-X Reflection Grating Spectrometer (RGS)

NASA Technical Reports Server (NTRS)

Schattenburg, Mark L.

2003-01-01

This Grant covers MIT support for the technology development of x-ray reflection gratings for the Constellation-X Reflection Grating Spectrometer (RGS). Since the start of the Grant MIT has extended its previously-developed patterning and super-smooth, blazed grating fabrication technology to ten-times smaller grating periods and ten-times larger blaze angles to demonstrate feasibility and performance in the off-plane grating geometry. In the past year we successfully developed several nanoimprint grating replication methods that achieved very high fidelity replication of master silicon gratings. Grating geometry on the nano and macro scales were faithfully replicated, demonstrating the viability of the process for manufacturing the thousands of gratings required for the RGS. We also successfully developed an improved metrology truss for holding test grating substrates during metrology. The flatness goal of grating substrates is under 500 nm. In the past, grating holders would cause non-repeatable distortion of >> 500 nm to the substrates due to friction and gravity sag. The new holder has a repeatability of under 50 nm which is adequate for the proposed RGS grating substrates.

X-ray beamsplitter

DOEpatents

Ceglio, N.M.; Stearns, D.G.; Hawryluk, A.M.; Barbee, T.W. Jr.

1987-08-07

An x-ray beamsplitter which splits an x-ray beam into two coherent parts by reflecting and transmitting some fraction of an incident beam has applications for x-ray interferometry, x-ray holography, x-ray beam manipulation, and x-ray laser cavity output couplers. The beamsplitter is formed of a wavelength selective multilayer thin film supported by a very thin x-ray transparent membrane. The beamsplitter resonantly transmits and reflects x-rays through thin film interference effects. A thin film is formed of 5--50 pairs of alternate Mo/Si layers with a period of 20--250 A. The support membrane is 10--200 nm of silicon nitride or boron nitride. The multilayer/support membrane structure is formed across a window in a substrate by first forming the structure on a solid substrate and then forming a window in the substrate to leave a free-standing structure over the window. 6 figs.

X-ray Reflected Spectra from Accretion Disk Models. III. A Complete Grid of Ionized Reflection Calculations

NASA Technical Reports Server (NTRS)

Garcia, J.; Dauser, T.; Reynolds, C. S.; Kallman, T. R.; McClintock, J. E.; Wilms, J.; Ekmann, W.

2013-01-01

We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code xillver that incorporates new routines and a richer atomic data base. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index Gamma of the illuminating radiation, the ionization parameter zeta at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A(sub Fe) relative to the solar value. The ranges of the parameters covered are: 1.2 <= Gamma <= 3.4, 1 <= zeta <= 104, and 0.5 <= A(sub Fe) <= 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file suitable for the analysis of X-ray observations via the atable model in xspec. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of xillver.

Polarimeter for Low Energy X-ray Astrophysical Sources (PLEXAS)

NASA Technical Reports Server (NTRS)

Murray, Stephen S.; Pierce, David L. (Technical Monitor)

2002-01-01

The Polarimeter for Low Energy X-ray Astrophysical Sources (PLEXAS) is an astrophysics mission concept for measuring the polarization of X-ray sources at low energies below the C-K band (less than 277 eV). PLEXAS uses the concept of variations in the reflectivity of a multilayered X-ray telescope as a function of the orientation of an X-rays polarization vector with respect to the reflecting surface of the optic. By selecting an appropriate multilayer, and rotating the X-ray telescope while pointing to a source, there will be a modulation in the source intensity, as measured at the focus of the telescope, which is proportional to the degree of polarization in the source.

SphinX Measurements of the 2009 Solar Minimum X-Ray Emission

NASA Astrophysics Data System (ADS)

Sylwester, J.; Kowalinski, M.; Gburek, S.; Siarkowski, M.; Kuzin, S.; Farnik, F.; Reale, F.; Phillips, K. J. H.; Bakała, J.; Gryciuk, M.; Podgorski, P.; Sylwester, B.

2012-06-01

The SphinX X-ray spectrophotometer on the CORONAS-PHOTON spacecraft measured soft X-ray emission in the 1-15 keV energy range during the deep solar minimum of 2009 with a sensitivity much greater than GOES. Several intervals are identified when the X-ray flux was exceptionally low, and the flux and solar X-ray luminosity are estimated. Spectral fits to the emission at these times give temperatures of 1.7-1.9 MK and emission measures between 4 × 1047 cm-3 and 1.1 × 1048 cm-3. Comparing SphinX emission with that from the Hinode X-ray Telescope, we deduce that most of the emission is from general coronal structures rather than confined features like bright points. For one of 27 intervals of exceptionally low activity identified in the SphinX data, the Sun's X-ray luminosity in an energy range roughly extrapolated to that of ROSAT (0.1-2.4 keV) was less than most nearby K and M dwarfs.

Analysis of Ti and TiO2 nanolayers by total reflection X-ray photoelectron spectroscopy

NASA Astrophysics Data System (ADS)

Kubala-Kukuś, A.; Banaś, D.; Stabrawa, I.; Szary, K.; Sobota, D.; Majewska, U.; Wudarczyk-Moćko, J.; Braziewicz, J.; Pajek, M.

2018-07-01

Total reflection X-ray photoelectron spectroscopy (TRXPS) is applied in the analysis of Ti and TiO2 nanolayers deposited on silicon and silicon dioxide substrates. The idea of application of total-reflection phenomenon for exciting X-ray used in the XPS technique is briefly discussed. The experimental setup and measurement conditions for the studied Ti and TiO2 layers are presented. The XPS spectra were registered both for the non-total and total reflection regimes. The survey spectra and C1s, N1s, Ti2p and O1s photoelectron peaks are shown. For energy calibration, the position of C1s photoelectron peak was applied (C-C component, binding energy 284.8 eV). The peak to background ratios are discussed as regards the dependence of the excitation angle. An increase of this ratio for the glancing angle 1°, being below critical angle of the X-ray beam and sample material, results in an improvement of XPS detection limit by factor up to 2. In the case of the Ti nanolayer, additionally, the thickness of the overlayer TiO2 is determined. As an example of applying the TRXPS technique, the analysis of Ti nanolayers implanted by highly charged Xe35+ ions of 280 keV energy is discussed. The Xe3d and O1s photoelectron peaks are presented and discussed.

X-ray reflectivity study of formation of multilayer porous anodic oxides of silicon.

DOE Office of Scientific and Technical Information (OSTI.GOV)

Chu, Y.; Fenollosa, R.; Parkhutik, V.

1999-07-21

The paper reports data on the kinetics of anodic oxide films growth on silicon in aqueous solutions of phosphoric acids as well as a study of the morphology of the oxides grown in a special regime of the oscillating anodic potential. X-ray reflectivity measurements were performed on the samples of anodic oxides using an intense synchrotron radiation source. They have a multilayer structure as revealed by theoretical fitting of the reflectivity data. The oscillations of the anodic potential are explained in terms of synchronized oxidation/dissolution reactions at the silicon surface and accumulation of mechanic stress in the oxide film.

X-RAY REFLECTED SPECTRA FROM ACCRETION DISK MODELS. III. A COMPLETE GRID OF IONIZED REFLECTION CALCULATIONS

DOE Office of Scientific and Technical Information (OSTI.GOV)

Garcia, J.; McClintock, J. E.; Dauser, T.

2013-05-10

We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code XILLVER that incorporates new routines and a richer atomic database. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index {Gamma} of the illuminating radiation, the ionization parameter {xi} at the surface of the disk (i.e., the ratio of the X-ray flux to themore » gas density), and the iron abundance A{sub Fe} relative to the solar value. The ranges of the parameters covered are 1.2 {<=} {Gamma} {<=} 3.4, 1 {<=} {xi} {<=} 10{sup 4}, and 0.5 {<=} A{sub Fe} {<=} 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file (http://hea-www.cfa.harvard.edu/{approx}javier/xillver/) suitable for the analysis of X-ray observations via the atable model in XSPEC. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of XILLVER.« less

JEUMICO: Czech-Bavarian astronomical X-ray optics project

NASA Astrophysics Data System (ADS)

Hudec, R.; Döhring, T.

2017-07-01

Within the project JEUMICO, an acronym for "Joint European Mirror Competence", the Aschaffenburg University of Applied Sciences and the Czech Technical University in Prague started a collaboration to develop mirrors for X-ray telescopes. Corresponding mirror segments use substrates of flat silicon wafers which are coated with thin iridium films, as this material is promising high reflectivity in the X-ray range of interest. The sputtering parameters are optimized in the context of the expected reflectivity of the coated X-ray mirrors. In near future measurements of the assembled mirror modules optical performances are planned at an X-ray test facility.

REDSoX: Monte-Carlo ray-tracing for a soft x-ray spectroscopy polarimeter

NASA Astrophysics Data System (ADS)

Günther, Hans M.; Egan, Mark; Heilmann, Ralf K.; Heine, Sarah N. T.; Hellickson, Tim; Frost, Jason; Marshall, Herman L.; Schulz, Norbert S.; Theriault-Shay, Adam

2017-08-01

X-ray polarimetry offers a new window into the high-energy universe, yet there has been no instrument so far that could measure the polarization of soft X-rays (about 17-80 Å) from astrophysical sources. The Rocket Experiment Demonstration of a Soft X-ray Polarimeter (REDSoX Polarimeter) is a proposed sounding rocket experiment that uses a focusing optic and splits the beam into three channels. Each channel has a set of criticalangle transmission (CAT) gratings that disperse the x-rays onto a laterally graded multilayer (LGML) mirror, which preferentially reflects photons with a specific polarization angle. The three channels are oriented at 120 deg to each other and thus measure the three Stokes parameters: I, Q, and U. The period of the LGML changes with position. The main design challenge is to arrange the gratings so that they disperse the spectrum in such a way that all rays are dispersed onto the position on the multi-layer mirror where they satisfy the local Bragg condition despite arriving on the mirror at different angles due to the converging beam from the focusing optics. We present a polarimeteric Monte-Carlo ray-trace of this design to assess non-ideal effects from e.g. mirror scattering or the finite size of the grating facets. With mirror properties both simulated and measured in the lab for LGML mirrors of 80-200 layers we show that the reflectivity and the width of the Bragg-peak are sufficient to make this design work when non-ideal effects are included in the simulation. Our simulations give us an effective area curve, the modulation factor and the figure of merit for the REDSoX polarimeter. As an example, we simulate an observation of Mk 421 and show that we could easily detect a 20% linear polarization.

Determination of fluorine by total reflection X-ray fluorescence spectrometry

NASA Astrophysics Data System (ADS)

Tarsoly, G.; Óvári, M.; Záray, Gy.

2010-04-01

There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). In this study, the analytical performance of the total reflection X-ray fluorescence spectrometry for determination of fluorine was investigated applying a spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a silicon drift detector (SDD) with ultra thin window was used. The detection limit for fluorine was found to be 5 mg L - 1 (equivalent to 10 ng absolute) in aqueous matrix. The linear range of the fluorine determination is between 15 and 500 mg L - 1 , within this range the precision is below 10%. The matrix effects of the other halogens (chlorine, bromine and iodine), and sulfate were also investigated. It has been established that the upper allowed concentration limit of the above interfering elements is 100, 200, 50 and 100 mg L - 1 for Cl, Br, I and sulfate, respectively. Moreover, the role of the pre-siliconization of the quartz carrier plate was investigated. It was found, that the presence of the silicone results in poorer analytical performance, which can be explained by the thicker sample residue and stronger self-absorption of the fluorescent radiation.

A new spectrometer for total reflection X-ray fluorescence analysis of light elements

NASA Astrophysics Data System (ADS)

Streli, Christina; Wobrauschek, Peter; Unfried, Ernst; Aiginger, Hannes

1993-10-01

A new spectrometer for total reflection X-ray fluorescence analysis (TXRF) of light elements as C, N, O, F, Na,… has been designed, constructed and realized. This was done under the aspect of optimizing all relevant parameters for excitation and detection under the conditions of Total Reflection in a vacuum chamber. A commercially available Ge(HP) detector with a diamond window offering a high transparency for low energy radiation was used. As excitation sources a special self-made windowless X-ray tube with Cu-target as well as a standard fine-focus Cr-tube were applied. Detection limits achieved are in the ng range for Carbon and Oxygen.

Angular Distribution of the X-ray Reflection in Accretion Disks

NASA Astrophysics Data System (ADS)

Garcia, Javier; Dauser, T.; Lohfink, A. M.; Kallman, T. R.; McClintock, J. E.; Steiner, J. F.; Brenneman, L.; Wilms, J.; Reynolds, C. S.; Tombesi, F.

2014-01-01

For the study of black holes, it is essential to have an accurate disk-reflection model with a proper treatment of the relativistic effects that occur near strong gravitational fields. These models are used to constrain the properties of the disk, including its inner radius, the degree of ionization of the gas, and the elemental abundances. Importantly, reflection models are the key to measuring black hole spin via the Fe-line method. However, most current reflection models only provide an angle-averaged solution for the flux reflected at the surface of the disk, which can systematically affect the inferred disk emission. We overcome this limitation by exploiting the full capabilities of our reflection code XILLVER. The solution of the reflected intensity of the radiation field is calculated for each photon energy, position in the slab, and viewing angle. We use this information to construct a grid of reflection models in which the inclination of the system is included as a free fitting parameter. Additionally, we directly connect the angle-resolved XILLVER model with the relativistic blurring code RELLINE to produce a self-consistent numerical model for to angular distribution of the reflected X-ray spectra from ionized accretion disks around black holes. The new model, RELCONV_XILL, is provided in the appropriate format to be used in combination with the commonly used fitting packages. An additional version of the new model, RELCONV_LP_XILL, which simulates the reflected spectra in a lampost scenario, is also supplied.

Surface Morphology of Liquid and Solid Thin Films via X-Ray Reflectivity.

NASA Astrophysics Data System (ADS)

Shindler, Joseph Daniel

X-ray reflectivity can be used to measure the spatial variations in the electron density on length scales from Angstroms to microns. It is sensitive to atomic scale roughness, interdiffusion in buried layers, the thickness of multilayer stacks, and in-plane correlations in each of these cases. We have pioneered the use of a high intensity, moderate resolution configuration for x-ray reflectivity which utilizes a bent crystal graphite monochromator. With this technique we can obtain a beam intensity one hundred times greater than is possible using the high resolution rotating anode configuration, while we have shown that the resulting instrumental resolution is appropriate for the vast majority of thin film work. For all of the systems studied, we were able to measure the weak diffuse scattering signal to probe the in-plane length scales of interfacial roughness, a measurement which had previously only been attempted at synchrotron sources. Studied systems include thin films and surfaces with a wide range of structural order and surface morphologies. Interest in liquid films has been of a fundamental nature. Theories on the expected film evolution with changing thickness and temperature are currently being tested with scattering experiments. We have pursued the issues of film/substrate wetting and conformality, focussing on the temperature dependence of these phenomena near the triple point. Despite the heterogeneity of the substrate potential, we see a very sharp wetting transition at or near the triple point, although below the triple point the film is still smooth, consistent with a uniform layer. We also see a loss of conformality as the fluid films thicken; this is consistent with theory and with other recent experiments. The properties of a multilayer solid film depend not only on the magnitude of the roughness of each interface, but also on the conformality between interfaces and the length scales of the roughness--i.e., whether the roughness is on the atomic

Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere

DOEpatents

Thoe, Robert S.

1991-01-01

Method and apparatus for producing sharp, chromatic, magnified images of X-ray emitting objects, are provided. The apparatus, which constitutes an X-ray microscope or telescope, comprises a connected collection of Bragg reflecting planes, comprised of either a bent crystal or a synthetic multilayer structure, disposed on and adjacent to a locus determined by a spherical surface. The individual Bragg planes are spatially oriented to Bragg reflect radiation from the object location toward the image location. This is accomplished by making the Bragg planes spatially coincident with the surfaces of either a nested series of prolate ellipsoids of revolution, or a nested series of spheres. The spacing between the Bragg reflecting planes can be tailored to control the wavelengths and the amount of the X-radiation that is Bragg reflected to form the X-ray image.

Reflective Coating for Lightweight X-Ray Optics

NASA Technical Reports Server (NTRS)

Chan, Kai-Wing; Zhang, William W.; Windt, David; Hong, Mao-Ling; Saha, Timo; McClelland, Ryan; Sharpe, Marton; Dwivedi, Vivek H.

2012-01-01

X-ray reflective coating for next generation's lightweight, high resolution, optics for astronomy requires thin-film deposition that is precisely fine-tuned so that it will not distort the thin sub-mm substrates. Film of very low stress is required. Alternatively, mirror distortion can be cancelled by precisely balancing the deformation from multiple films. We will present results on metallic film deposition for the lightweight optics under development. These efforts include: low-stress deposition by magnetron sputtering and atomic layer deposition of the metals, balancing of gross deformation with two-layer depositions of opposite stresses and with depositions on both sides of the thin mirrors.

[Contrast of Z-Pinch X-Ray Yield Measure Technique].

PubMed

Li, Mo; Wang, Liang-ping; Sheng, Liang; Lu, Yi

2015-03-01

Resistive bolometer and scintillant detection system are two mainly Z-pinch X-ray yield measure techniques which are based on different diagnostic principles. Contrasting the results from two methods can help with increasing precision of X-ray yield measurement. Experiments with different load material and shape were carried out on the "QiangGuang-I" facility. For Al wire arrays, X-ray yields measured by the two techniques were largely consistent. However, for insulating coating W wire arrays, X-ray yields taken from bolometer changed with load parameters while data from scintillant detection system hardly changed. Simulation and analysis draw conclusions as follows: (1) Scintillant detection system is much more sensitive to X-ray photons with low energy and its spectral response is wider than the resistive bolometer. Thus, results from the former method are always larger than the latter. (2) The responses of the two systems are both flat to Al plasma radiation. Thus, their results are consistent for Al wire array loads. (3) Radiation form planar W wire arrays is mainly composed of sub-keV soft X-ray. X-ray yields measured by the bolometer is supposed to be accurate because of the nickel foil can absorb almost all the soft X-ray. (4) By contrast, using planar W wire arrays, data from scintillant detection system hardly change with load parameters. A possible explanation is that while the distance between wires increases, plasma temperature at stagnation reduces and spectra moves toward the soft X-ray region. Scintillator is much more sensitive to the soft X-ray below 200 eV. Thus, although the total X-ray yield reduces with large diameter load, signal from the scintillant detection system is almost the same. (5) Both Techniques affected by electron beams produced by the loads.

Simultaneous measurement of X-ray specular reflection and off-specular diffuse scattering from liquid surfaces using a two-dimensional pixel array detector: the liquid-interface reflectometer of BL37XU at SPring-8.

PubMed

Yano, Yohko F; Uruga, Tomoya; Tanida, Hajime; Toyokawa, Hidenori; Terada, Yasuko; Yamada, Hironari

2010-07-01

An X-ray reflectometer for simultaneous measurement of specular and off-specular reflection of liquid surfaces is described. The reflectometer, equipped with a two-dimensional single X-ray photon-counting pixel array detector obtained the full range of X-ray specular and off-specular reflections in an extremely short time (1 s). Both the specular and off-specular reflection of water exhibited good agreement with the predicted capillary-wave theory within the appropriate instrumental resolution. The approach is also demonstrated on an aqueous solution of 1-dodecyl-3-methylimidazolium chloride. The monolayer in which the dodecyl chain faces upwards and the Cl(-) anion locates next to the imidazolium ring formed on the water surface was found to be laterally homogeneous. The use of a pixel array detector will be particularly powerful for in situ measurements to investigate both out-of-plane and in-plane structures simultaneously, not only for liquid surfaces but also for other thin films.

Portable total reflection x-ray fluorescence analysis in the identification of unknown laboratory hazards

DOE Office of Scientific and Technical Information (OSTI.GOV)

Liu, Ying, E-mail: liu.ying.48r@st.kyoto-u.ac.jp; Imashuku, Susumu; Sasaki, Nobuharu

In this study, a portable total reflection x-ray fluorescence (TXRF) spectrometer was used to analyze unknown laboratory hazards that precipitated on exterior surfaces of cooling pipes and fume hood pipes in chemical laboratories. With the aim to examine the accuracy of TXRF analysis for the determination of elemental composition, analytical results were compared with those of wavelength-dispersive x-ray fluorescence spectrometry, scanning electron microscope and energy-dispersive x-ray spectrometry, energy-dispersive x-ray fluorescence spectrometry, inductively coupled plasma atomic emission spectrometry, x-ray diffraction spectrometry (XRD), and x-ray photoelectron spectroscopy (XPS). Detailed comparison of data confirmed that the TXRF method itself was not sufficient tomore » determine all the elements (Z > 11) contained in the samples. In addition, results suggest that XRD should be combined with XPS in order to accurately determine compound composition. This study demonstrates that at least two analytical methods should be used in order to analyze the composition of unknown real samples.« less

Soft-x-ray magneto-optical Kerr effect and element-specific hysteresis measurement

DOE Office of Scientific and Technical Information (OSTI.GOV)

Kortright, J.B.; Rice, M.

1997-04-01

Interest in the utilization of x-ray magneto-optical properties to provide element-specific magnetic information, combined with recent development of tunable linear polarizers for spectroscopic polarization measurement, have led the authors to the study of magneto-optical rotation (MOR) near core levels of magnetic atoms in magnetic multilayer and alloy films. Their initial observation of Faraday rotation (in transmission) demonstrated that for Fe MOR is easily measured and is larger at its L{sub 3} resonance than in the near-visible spectral regions. This work also demonstrated that the spectroscopic behavior of the MOR signal in transmission, resulting from the differential reaction of left- andmore » right-circular components of a linearly polarized beam, is related to the magnetic circular dichroism (MCD), or differential absorption, as expected by a Kramers-Kronig transformation. Thus MCD measurements using circular polarization and MOR measurements using linear polarization can provide complementary, and in some cases equivalent, information. On beamline 6.3.2 the authors have begun to investigate soft x-ray MOR in the reflection geometry, the x-ray magneto-optic Kerr effect (XMOKE). Early measurements have demonstrated the ability to measure element-specific hysteresis loops and large rotations compared to analogous near-visible measurements. The authors are investigating the spectral dependence of the XMOKE signal, and have initiated systematic materials studies of sputter-deposited films of Fe, Fe{sub x}Cr{sub 1{minus}x} alloys, and Fe/Cr multilayers.« less

Probing Ultrafast Electron Dynamics at Surfaces Using Soft X-Ray Transient Reflectivity Spectroscopy

NASA Astrophysics Data System (ADS)

Baker, L. Robert; Husek, Jakub; Biswas, Somnath; Cirri, Anthony

The ability to probe electron dynamics with surface sensitivity on the ultrafast time scale is critical for understanding processes such as charge separation, injection, and surface trapping that mediate efficiency in catalytic and energy conversion materials. Toward this goal, we have developed a high harmonic generation (HHG) light source for femtosecond soft x-ray reflectivity. Using this light source we investigated the ultrafast carrier dynamics at the surface of single crystalline α-Fe2O3, polycrystalline α-Fe2O3, and the mixed metal oxide, CuFeO2. We have recently demonstrated that CuFeO2 in particular is a selective catalyst for photo-electrochemical CO2 reduction to acetate; however, the role of electronic structure and charge carrier dynamics in mediating catalytic selectivity has not been well understood. Soft x-ray reflectivity measurements probe the M2,3, edges of the 3d transition metals, which provide oxidation and spin state resolution with element specificity. In addition to chemical state specificity, these measurements are also surface sensitive, and by independently simulating the contributions of the real and imaginary components of the complex refractive index, we can differentiate between surface and sub-surface contributions to the excited state spectrum. Accordingly, this work demonstrates the ability to probe ultrafast carrier dynamics in catalytic materials with element and chemical state specificity and with surface sensitivity.

X-Ray Laser

DTIC Science & Technology

1991-01-31

Reflection in Relativistic Electron Beam Channel Radiation Systems, IEEE Trans. on Plasma Science 16(5), 548 (1988). 3. M. Strauss, P. Amendt, N...Reduced Radiation Losses in a Channeled-Beam X-Ray Laser by Bragg Reflection Coupling, Phys. Rev. A 39(11), 5791 (1989). 6. M. Strauss and N. Rostoker... Radiation Guiding in Channeling Beam X-Ray Laser by Bragg Reflection Coupling, Phys. Rev. A 40(12), 7097 (1989). 91-00870111 llllltl

Measuring the Dust Grains and Distance to X Persei Via Its X-ray Halo

NASA Astrophysics Data System (ADS)

Smith, Randall

2006-09-01

We propose to observe the X-ray halo of the high mass X-ray binary pulsar X Per to measure interstellar dust grains along the line of sight (LOS) and to determine the distance to X Per. The X-ray halo is formed by scattering from grains along the LOS, which for X Per appear to be concentrated in one molecular cloud. Unlike many other X-ray halo observations, this low-absorption high-latitude sightline is well-characterized from absorption spectroscopy done with HST, Copernicus, and FUSE. This halo observation will measure the distance to the cloud and the dust size distribution in it. We will also be able to determine the distance to X Per by measuring the time delayed pulses in the X-ray halo.

Testing the Pairs-Reflection Model with X-Ray Spectral Variability and X-Ray Properties of Complete Samples of Radio-Selected BL Lacertae Objects

NASA Astrophysics Data System (ADS)

Urry, C. Megan

1997-01-01

This grant was awarded to Dr. C. Megan Urry of the Space Telescope Science Institute in response to two successful ADP proposals to use archival Ginga and Rosat X-ray data for 'Testing the Pairs-Reflection model with X-Ray Spectral Variability' (in collaboration with Paola Grandi, now at the University of Rome) and 'X-Ray Properties of Complete Samples of Radio-Selected BL Lacertae Objects' (in collaboration with then-graduate student Rita Sambruna, now a post-doc at Goddard Space Flight Center). In addition, post-docs Joseph Pesce and Elena Pian, and graduate student Matthew O'Dowd, have worked on several aspects of these projects. The grant was originally awarded on 3/01/94; this report covers the full period, through May 1997. We have completed our project on the X-ray properties of radio-selected BL Lacs.

Measuring the x-ray resolving power of bent potassium acid phthalate diffraction crystals

DOE Office of Scientific and Technical Information (OSTI.GOV)

Haugh, M. J., E-mail: haughmj@nv.doe.gov; Jacoby, K. D.; Wu, M.

2014-11-15

This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals thatmore » we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories in Albuquerque, New Mexico. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a double crystal diffractometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.« less

Measuring the X-ray Resolving Power of Bent Potassium Acid Phthalate Diffraction Crystals

DOE Office of Scientific and Technical Information (OSTI.GOV)

Haugh, M. J.; Wu, M.; Jacoby, K. D.

2014-11-01

This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals thatmore » we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories (SNL) in Albuquerque, NM. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a dual goniometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.« less

Measuring the x-ray resolving power of bent potassium acid phthalate diffraction crystalsa)

NASA Astrophysics Data System (ADS)

Haugh, M. J.; Wu, M.; Jacoby, K. D.; Loisel, G. P.

2014-11-01

This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals that we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories in Albuquerque, New Mexico. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a double crystal diffractometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.

Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structures.

PubMed

Hayashi, Kouichi

2010-12-01

Based on our previous work, I review the applications of x-ray refraction and the x-ray waveguide phenomenon to organic and inorganic thin films in the present paper. Under grazing incidence conditions, observations of refracted x-rays and guided x-rays due to the x-ray waveguide phenomenon provide information about thin film structures, and thus have potential as alternative methods to x-ray reflectivity. To date, we have measured the spectra of the refracted x-rays and guided x-rays from end faces of thin films using white incident x-ray beams, and utilized them for the determination of film density and thickness. Some of this work is summarized in the present paper. At the end of this paper, I describe our recent achievement in this field, namely the in situ measurement of guided x-rays during the film degradation process due to strong synchrotron radiation damage. Moreover, I discuss the perspective of the present technique from the viewpoint of micro-characterization and real-time estimation of thin films.

Determining the Uncertainty of X-Ray Absorption Measurements

PubMed Central

Wojcik, Gary S.

2004-01-01

X-ray absorption (or more properly, x-ray attenuation) techniques have been applied to study the moisture movement in and moisture content of materials like cement paste, mortar, and wood. An increase in the number of x-ray counts with time at a location in a specimen may indicate a decrease in moisture content. The uncertainty of measurements from an x-ray absorption system, which must be known to properly interpret the data, is often assumed to be the square root of the number of counts, as in a Poisson process. No detailed studies have heretofore been conducted to determine the uncertainty of x-ray absorption measurements or the effect of averaging data on the uncertainty. In this study, the Poisson estimate was found to adequately approximate normalized root mean square errors (a measure of uncertainty) of counts for point measurements and profile measurements of water specimens. The Poisson estimate, however, was not reliable in approximating the magnitude of the uncertainty when averaging data from paste and mortar specimens. Changes in uncertainty from differing averaging procedures were well-approximated by a Poisson process. The normalized root mean square errors decreased when the x-ray source intensity, integration time, collimator size, and number of scanning repetitions increased. Uncertainties in mean paste and mortar count profiles were kept below 2 % by averaging vertical profiles at horizontal spacings of 1 mm or larger with counts per point above 4000. Maximum normalized root mean square errors did not exceed 10 % in any of the tests conducted. PMID:27366627

Refractive optics to compensate x-ray mirror shape-errors

NASA Astrophysics Data System (ADS)

Laundy, David; Sawhney, Kawal; Dhamgaye, Vishal; Pape, Ian

2017-08-01

Elliptically profiled mirrors operating at glancing angle are frequently used at X-ray synchrotron sources to focus X-rays into sub-micrometer sized spots. Mirror figure error, defined as the height difference function between the actual mirror surface and the ideal elliptical profile, causes a perturbation of the X-ray wavefront for X- rays reflecting from the mirror. This perturbation, when propagated to the focal plane results in an increase in the size of the focused beam. At Diamond Light Source we are developing refractive optics that can be used to locally cancel out the wavefront distortion caused by figure error from nano-focusing elliptical mirrors. These optics could be used to correct existing optical components on synchrotron radiation beamlines in order to give focused X-ray beam sizes approaching the theoretical diffraction limit. We present our latest results showing measurement of the X-ray wavefront error after reflection from X-ray mirrors and the translation of the measured wavefront into a design for refractive optical elements for correction of the X-ray wavefront. We show measurement of the focused beam with and without the corrective optics inserted showing reduction in the size of the focus resulting from the correction to the wavefront.

Method for spatially modulating X-ray pulses using MEMS-based X-ray optics

DOE Office of Scientific and Technical Information (OSTI.GOV)

Lopez, Daniel; Shenoy, Gopal; Wang, Jin

A method and apparatus are provided for spatially modulating X-rays or X-ray pulses using microelectromechanical systems (MEMS) based X-ray optics. A torsionally-oscillating MEMS micromirror and a method of leveraging the grazing-angle reflection property are provided to modulate X-ray pulses with a high-degree of controllability.

Note: application of a pixel-array area detector to simultaneous single crystal X-ray diffraction and X-ray absorption spectroscopy measurements.

PubMed

Sun, Cheng-Jun; Zhang, Bangmin; Brewe, Dale L; Chen, Jing-Sheng; Chow, G M; Venkatesan, T; Heald, Steve M

2014-04-01

X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) are two main x-ray techniques in synchrotron radiation facilities. In this Note, we present an experimental setup capable of performing simultaneous XRD and XAS measurements by the application of a pixel-array area detector. For XRD, the momentum transfer in specular diffraction was measured by scanning the X-ray energy with fixed incoming and outgoing x-ray angles. By selecting a small fixed region of the detector to collect the XRD signal, the rest of the area was available for collecting the x-ray fluorescence for XAS measurements. The simultaneous measurement of XRD and X-ray absorption near edge structure for Pr0.67Sr0.33MnO3 film was demonstrated as a proof of principle for future time-resolved pump-probe measurements. A static sample makes it easy to maintain an accurate overlap of the X-ray spot and laser pump beam.

FPGA-Based X-Ray Detection and Measurement for an X-Ray Polarimeter

NASA Technical Reports Server (NTRS)

Gregory, Kyle; Hill, Joanne; Black, Kevin; Baumgartner, Wayne

2013-01-01

This technology enables detection and measurement of x-rays in an x-ray polarimeter using a field-programmable gate array (FPGA). The technology was developed for the Gravitational and Extreme Magnetism Small Explorer (GEMS) mission. It performs precision energy and timing measurements, as well as rejection of non-x-ray events. It enables the GEMS polarimeter to detect precisely when an event has taken place so that additional measurements can be made. The technology also enables this function to be performed in an FPGA using limited resources so that mass and power can be minimized while reliability for a space application is maximized and precise real-time operation is achieved. This design requires a low-noise, charge-sensitive preamplifier; a highspeed analog to digital converter (ADC); and an x-ray detector with a cathode terminal. It functions by computing a sum of differences for time-samples whose difference exceeds a programmable threshold. A state machine advances through states as a programmable number of consecutive samples exceeds or fails to exceed this threshold. The pulse height is recorded as the accumulated sum. The track length is also measured based on the time from the start to the end of accumulation. For track lengths longer than a certain length, the algorithm estimates the barycenter of charge deposit by comparing the accumulator value at the midpoint to the final accumulator value. The design also employs a number of techniques for rejecting background events. This innovation enables the function to be performed in space where it can operate autonomously with a rapid response time. This implementation combines advantages of computing system-based approaches with those of pure analog approaches. The result is an implementation that is highly reliable, performs in real-time, rejects background events, and consumes minimal power.

X ray based displacement measurement for hostile environments

NASA Technical Reports Server (NTRS)

Canistraro, Howard A.; Jordon, Eric H.; Pease, Douglas M.; Fralick, Gustave C.

1992-01-01

A new method on noncontacting, high temperature extensometry based on the focus and scanning of x rays is currently under development and shows great promise of overcoming limitations associated with available techniques. The chief advantage is the ability to make undisturbed measurements through stratified or flowing gases, smoke, and flame. The system is based on the ability to focus and scan low energy, hard x rays such as those emanating from copper or molybdenum sources. The x rays are focused into a narrow and intense line image which can be scanned onto targets that fluoresce secondary x ray radiation. The final goal of the system is the ability to conduct macroscopic strain measurements in hostile environments by utilizing two or more fluorescing targets. Current work is limited to displacement measurement of a single target with a resolution of 1.25 micro-m and a target temperature of 1200 C, directly through an open flame. The main advantage of the technique lies in the penetrating nature of x rays which are not affected by the presence of refracting gas layers, smoke, flame, or intense thermal radiation, all of which could render conventional extensometry methods inoperative or greatly compromise their performance.

Grazing-incidence coherent x-ray imaging in true reflection geometry

NASA Astrophysics Data System (ADS)

Sun, Tao; Jiang, Zhang; Strzalka, Joseph; Wang, Jin

2012-02-01

The development of the 3^rd and 4^th generation synchrotrons has stimulated extensive research activities in x-ray imaging techniques. Among all, coherent diffractive imaging (CDI) shows great promise, as its resolution is only limited by the wavelength of the source. Most of the CDI work reported thus far used transmission geometry, which however is not suitable for samples on opaque substrates or in which only the surfaces are the regions of interest. Even though two groups have performed CDI experiments (using laser or x-ray) in reflection geometry and succeeded in reconstructing the planar image of the surface, the theoretical underpinnings and analysis approaches of their techniques are essentially identical to transmission CDI. Most importantly, they couldn't obtain the structural information along sample thickness direction. Here, we introduce a reflection CDI technique that works at grazing-incidence geometry. By visualizing Au nanostructures fabricated on Si substrate, we demonstrate that this innovative imaging technique is capable of obtaining both 2D and 3D information of surfaces or buried structures in the samples. In the meanwhile, we will also explain the grazing-incidence-scattering based-algorithm developed for 3D phase retrieval.

Microstructure and composition analysis of low-Z/low-Z multilayers by combining hard and resonant soft X-ray reflectivity

DOE Office of Scientific and Technical Information (OSTI.GOV)

Rao, P. N., E-mail: pnrao@rrcat.gov.in; Rai, S. K.; Srivastava, A. K.

2016-06-28

Microstructure and composition analysis of periodic multilayer structure consisting of a low electron density contrast (EDC) material combination by grazing incidence hard X-ray reflectivity (GIXR), resonant soft X-ray reflectivity (RSXR), and transmission electron microscopy (TEM) are presented. Measurements of reflectivity at different energies allow combining the sensitivity of GIXR data to microstructural parameters like layer thicknesses and interfacing roughness, with the layer composition sensitivity of RSXR. These aspects are shown with an example of 10-period C/B{sub 4}C multilayer. TEM observation reveals that interfaces C on B{sub 4}C and B{sub 4}C on C are symmetric. Although GIXR provides limited structural informationmore » when EDC between layers is low, measurements using a scattering technique like GIXR with a microscopic technique like TEM improve the microstructural information of low EDC combination. The optical constants of buried layers have been derived by RSXR. The derived optical constants from the measured RSXR data suggested the presence of excess carbon into the boron carbide layer.« less

High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.

PubMed

Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf A; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan

2017-10-10

V/Sc multilayer is experimentally demonstrated for the first time as a high reflectance mirror for the soft X-ray water window region. It primarily works at above the Sc-L edge (λ = 3.11 nm) under near normal incidence while a second peak appears at above the V-L edge (λ = 2.42 nm) under grazing incidence. The V/Sc multilayer fabricated with a d-spacing of 1.59 nm and 30 bilayers has a smaller interface width (σ = 0.27 and 0.32 nm) than the conventional used Cr/Sc (σ = 0.28 and 0.47 nm). For V/Sc multilayer with 30 bilayers, the introduction of B 4 C barrier layers has little improvement on the interface structure. As the number of bilayers increasing to 400, the growth morphology and microstructure of the V/Sc layers evolves with slightly increased crystallization. Nevertheless, the surface roughness remains to be 0.25 nm. A maximum soft X-ray reflectance of 18.4% is measured at λ = 3.129 nm at 9° off-normal incidence using the 400-bilayers V/Sc multilayer. According to the fitted model, an s-polarization reflectance of 5.2% can also be expected at λ = 2.425 nm under 40° incidence. Based on the promising experimental results, further improvement of the reflectance can be achieved by using a more stable deposition system, exploring different interface engineering methods and so on.

X-ray diffraction and X-ray standing-wave study of the lead stearate film structure

DOE Office of Scientific and Technical Information (OSTI.GOV)

Blagov, A. E.; Dyakova, Yu. A.; Kovalchuk, M. V.

2016-05-15

A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer ofmore » the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.« less

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

DOE Office of Scientific and Technical Information (OSTI.GOV)

Patommel, Jens; Klare, Susanne; Hoppe, Robert

In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection, the concept of adiabatically focusing refractive lenses was proposed to overcome this limit. Here, we present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10 –3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

DOE PAGES

Patommel, Jens; Klare, Susanne; Hoppe, Robert; ...

2017-03-06

In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection, the concept of adiabatically focusing refractive lenses was proposed to overcome this limit. Here, we present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10 –3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.

X-Ray Reflected Spectra from Accretion Disk Models. II. Diagnostic Tools for X-Ray Observations

NASA Technical Reports Server (NTRS)

Garcia, J.; Kallman, T. R.; Mushotzky, R. F.

2011-01-01

We present a comprehensive study of the emission spectra from accreting sources. We use our new reflection code to compute the reflected spectra from an accretion disk illuminated by X-rays. This set of models covers different values of ionization parameter, solar iron abundance and photon index for the illuminating spectrum. These models also include the most complete and recent atomic data for the inner-shell of the iron and oxygen isonuclear sequences. We concentrate our analysis to the 2 - 10 keV energy region, and in particular to the iron K-shell emission lines. We show the dependency of the equivalent width (EW) of the Fe Ka with the ionization parameter. The maximum value of the EW is approx. 800 eV for models with log Epsilon approx. 1.5, and decreases monotonically as Epsilon increases. For lower values of Epsilon the Fe K(alpha) EW decreases to a minimum near log Epsilon approx. 0.8. We produce simulated CCD observations based on our reflection models. For low ionized, reflection dominated cases, the 2 -10 keV energy region shows a very broad, curving continuum that cannot be represented by a simple power-law. We show that in addition to the Fe K-shell emission, there are other prominent features such as the Si and S L(alpha) lines, a blend of Ar VIII-XI lines, and the Ca x K(alpha) line. In some cases the S xv blends with the He-like Si RRC producing a broad feature that cannot be reproduced by a simple Gaussian profile. This could be used as a signature of reflection.

Feasibility study of total reflection X-ray fluorescence analysis using a liquid metal jet X-ray tube

NASA Astrophysics Data System (ADS)

Maderitsch, A.; Smolek, S.; Wobrauschek, P.; Streli, C.; Takman, P.

2014-09-01

Total reflection X-ray spectroscopy (TXRF) is a powerful analytical technique for qualitative and quantitative analysis of trace and ultratrace elements in a sample with lower limits of detection (LLDs) of pg/g to ng/g in concentration and absolute high fg levels are attainable. Several X-ray sources, from low power (few W), 18 kW rotating anodes to synchrotron radiation, are in use for the excitation and lead accordingly to their photon flux delivered on the sample the detection limits specified. Not only the power, but also the brilliance and focal shape are of importance for TXRF. A microfocus of 50-100 μm spot size or the line focus of diffraction tubes is best suited. Excillum developed a new approach in the design of a source: the liquid metal jet anode. In this paper the results achieved with this source are described. A versatile TXRF spectrometer with vacuum chamber designed at Atominstitut was used for the experiments. A multilayer monochromator selecting the intensive Ga-Kα radiation was taken and the beam was collimated by 50 μm slits. Excellent results regarding geometric beam stability, high fluorescence intensities and low background were achieved leading to detection limits in the high fg range for Ni. A 100 mm2 silicon drift detector (SDD) collimated to 80 mm2 was used to collect the fluorescence radiation. The results from measurements on single element samples are presented.

Novel ultra-lightweight and high-resolution MEMS x-ray optics

NASA Astrophysics Data System (ADS)

Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Takagi, Utako; Mita, Makoto; Riveros, Raul; Yamaguchi, Hitomi; Kato, Fumiki; Sugiyama, Susumu; Fujiwara, Kouzou; Morishita, Kohei; Nakajima, Kazuo; Fujihira, Shinya; Kanamori, Yoshiaki; Yamasaki, Noriko Y.; Mitsuda, Kazuhisa; Maeda, Ryutaro

2009-05-01

We have been developing ultra light-weight X-ray optics using MEMS (Micro Electro Mechanical Systems) technologies.We utilized crystal planes after anisotropic wet etching of silicon (110) wafers as X-ray mirrors and succeeded in X-ray reflection and imaging. Since we can etch tiny pores in thin wafers, this type of optics can be the lightest X-ray telescope. However, because the crystal planes are alinged in certain directions, we must approximate ideal optical surfaces with flat planes, which limits angular resolution of the optics on the order of arcmin. In order to overcome this issue, we propose novel X-ray optics based on a combination of five recently developed MEMS technologies, namely silicon dry etching, X-ray LIGA, silicon hydrogen anneal, magnetic fluid assisted polishing and hot plastic deformation of silicon. In this paper, we describe this new method and report on our development of X-ray mirrors fabricated by these technologies and X-ray reflection experiments of two types of MEMS X-ray mirrors made of silicon and nickel. For the first time, X-ray reflections on these mirrors were detected in the angular response measurements. Compared to model calculations, surface roughness of the silicon and nickel mirrors were estimated to be 5 nm and 3 nm, respectively.

Venus Measurements by the MESSENGER Gamma-Ray and X-Ray Spectrometers

NASA Astrophysics Data System (ADS)

Rhodes, E. A.; Starr, R. D.; Goldsten, J. O.; Schlemm, C. E.; Boynton, W. V.

2007-12-01

The Gamma-Ray Spectrometer (GRS), which is a part of the Gamma-Ray and Neutron Spectrometer Instrument, and the X-Ray Spectrometer (XRS) on the MESSENGER spacecraft made calibration measurements during the Venus flyby on June 5, 2007. The purpose of these instruments is to determine elemental abundances on the surface of Mercury. The GRS measures gamma-rays emitted from element interactions with cosmic rays impinging on the surface, while the XRS measures X-ray emissions induced on the surface by the incident solar flux. The GRS sensor is a high-resolution high-purity Ge detector cooled by a Stirling cryocooler, surrounded by a borated-plastic anticoincidence shield. The GRS is sensitive to gamma-rays up to ~10 MeV and can identify most major elements, sampling down to depths of about ten centimeters. Only the shield was powered on for this flyby in order to conserve cooler lifetime. Gamma-rays were observed coming from Venus as well as from the spacecraft. Although the Venus gamma-rays originate from its thick atmosphere rather than its surface, the GRS data from this encounter will provide useful calibration data from a source of known composition. In particular, the data will be useful for determining GRS sensitivity and pointing options for the Mercury flybys, the first of which will be in January 2008. The X-ray spectrum of a planetary surface is dominated by a combination of the fluorescence and scattered solar X-rays. The most prominent fluorescent lines are the Kα lines from the major elements Mg, Al, Si, S, Ca, Ti, and Fe (1-10 keV). The sampling depth is less than 100 u m. The XRS is similar in design to experiments flown on Apollo 15 and 16 and the NEAR-Shoemaker mission. Three large-area gas-proportional counters view the planet, and a small Si-PIN detector mounted on the spacecraft sunshade monitors the Sun. The energy resolution of the gas proportional counters (~850 eV at 5.9 keV) is sufficient to resolve the X-ray lines above 2 keV, but Al and Mg

Intensity correlation measurement system by picosecond single shot soft x-ray laser.

PubMed

Kishimoto, Maki; Namikawa, Kazumichi; Sukegawa, Kouta; Yamatani, Hiroshi; Hasegawa, Noboru; Tanaka, Momoko

2010-01-01

We developed a new soft x-ray speckle intensity correlation spectroscopy system by use of a single shot high brilliant plasma soft x-ray laser. The plasma soft x-ray laser is characterized by several picoseconds in pulse width, more than 90% special coherence, and 10(11) soft x-ray photons within a single pulse. We developed a Michelson type delay pulse generator using a soft x-ray beam splitter to measure the intensity correlation of x-ray speckles from materials and succeeded in generating double coherent x-ray pulses with picosecond delay times. Moreover, we employed a high-speed soft x-ray streak camera for the picosecond time-resolved measurement of x-ray speckles caused by double coherent x-ray pulse illumination. We performed the x-ray speckle intensity correlation measurements for probing the relaxation phenomena of polarizations in polarization clusters in the paraelectric phase of the ferroelectric material BaTiO(3) near its Curie temperature and verified its performance.

Crystals for astronomical X-ray spectroscopy

NASA Technical Reports Server (NTRS)

Burek, A.

1976-01-01

Crystal spectrometric properties and the factors that affect their measurement are discussed. Theoretical and experimental results on KAP are summarized and theoretical results based on the dynamical theory of X-ray diffraction are given for the acid phthalates as well as for the commonly used planes of ADP, PET and EDDT. Anomalous dispersion is found to be important for understanding the details of crystal Bragg reflection properties at long X-ray wavelengths and some important effects are pointed out. The theory of anomalous dispersion is applied to explain the anomalous reflectivity exhibited by KAP at 23.3 A.

Combination of grazing incidence x-ray fluorescence with x-ray reflectivity in one table-top spectrometer for improved characterization of thin layer and implants on/in silicon wafers

DOE Office of Scientific and Technical Information (OSTI.GOV)

Ingerle, D.; Schiebl, M.; Streli, C.

2014-08-15

As Grazing Incidence X-ray Fluorescence (GIXRF) analysis does not provide unambiguous results for the characterization of nanometre layers as well as nanometre depth profiles of implants in silicon wafers by its own, the approach of providing additional information using the signal from X-ray Reflectivity (XRR) was tested. As GIXRF already uses an X-ray beam impinging under grazing incidence and the variation of the angle of incidence, a GIXRF spectrometer was adapted with an XRR unit to obtain data from the angle dependent fluorescence radiation as well as data from the reflected beam. A θ-2θ goniometer was simulated by combining amore » translation and tilt movement of a Silicon Drift detector, which allows detecting the reflected beam over 5 orders of magnitude. HfO{sub 2} layers as well as As implants in Silicon wafers in the nanometre range were characterized using this new setup. A just recently published combined evaluation approach was used for data evaluation.« less

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

DOE Office of Scientific and Technical Information (OSTI.GOV)

Su P.; Kaznatcheev K.; Wang, Y.

In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure surface slope errors with precision and accuracy better than 100 nrad (rms) and {approx}200 nrad (rms), respectively, with a lateral resolution of few mm or less. We present results of the calibration of the metrology systems, discuss their accuracy and address the precision in measuring amore » spherical mirror.« less

New consistency tests for high-accuracy measurements of X-ray mass attenuation coefficients by the X-ray extended-range technique.

PubMed

Chantler, C T; Islam, M T; Rae, N A; Tran, C Q; Glover, J L; Barnea, Z

2012-03-01

An extension of the X-ray extended-range technique is described for measuring X-ray mass attenuation coefficients by introducing absolute measurement of a number of foils - the multiple independent foil technique. Illustrating the technique with the results of measurements for gold in the 38-50 keV energy range, it is shown that its use enables selection of the most uniform and well defined of available foils, leading to more accurate measurements; it allows one to test the consistency of independently measured absolute values of the mass attenuation coefficient with those obtained by the thickness transfer method; and it tests the linearity of the response of the counter and counting chain throughout the range of X-ray intensities encountered in a given experiment. In light of the results for gold, the strategy to be ideally employed in measuring absolute X-ray mass attenuation coefficients, X-ray absorption fine structure and related quantities is discussed.

Flat Field Anomalies in an X-ray CCD Camera Measured Using a Manson X-ray Source

DOE Office of Scientific and Technical Information (OSTI.GOV)

M. J. Haugh and M. B. Schneider

2008-10-31

The Static X-ray Imager (SXI) is a diagnostic used at the National Ignition Facility (NIF) to measure the position of the X-rays produced by lasers hitting a gold foil target. The intensity distribution taken by the SXI camera during a NIF shot is used to determine how accurately NIF can aim laser beams. This is critical to proper NIF operation. Imagers are located at the top and the bottom of the NIF target chamber. The CCD chip is an X-ray sensitive silicon sensor, with a large format array (2k x 2k), 24 μm square pixels, and 15 μm thick. Amore » multi-anode Manson X-ray source, operating up to 10kV and 10W, was used to characterize and calibrate the imagers. The output beam is heavily filtered to narrow the spectral beam width, giving a typical resolution E/ΔE≈10. The X-ray beam intensity was measured using an absolute photodiode that has accuracy better than 1% up to the Si K edge and better than 5% at higher energies. The X-ray beam provides full CCD illumination and is flat, within ±1% maximum to minimum. The spectral efficiency was measured at 10 energy bands ranging from 930 eV to 8470 eV. We observed an energy dependent pixel sensitivity variation that showed continuous change over a large portion of the CCD. The maximum sensitivity variation occurred at 8470 eV. The geometric pattern did not change at lower energies, but the maximum contrast decreased and was not observable below 4 keV. We were also able to observe debris, damage, and surface defects on the CCD chip. The Manson source is a powerful tool for characterizing the imaging errors of an X-ray CCD imager. These errors are quite different from those found in a visible CCD imager.« less

Imaging Schwarzschild multilayer X-ray microscope

NASA Technical Reports Server (NTRS)

Hoover, Richard B.; Baker, Phillip C.; Shealy, David L.; Core, David B.; Walker, Arthur B. C., Jr.; Barbee, Troy W., Jr.; Kerstetter, Ted

1993-01-01

We have designed, analyzed, fabricated, and tested Schwarzschild multilayer X-ray microscopes. These instruments use flow-polished Zerodur mirror substrates which have been coated with multilayers optimized for maximum reflectivity at normal incidence at 135 A. They are being developed as prototypes for the Water Window Imaging X-Ray Microscope. Ultrasmooth mirror sets of hemlite grade sapphire have been fabricated and they are now being coated with multilayers to reflect soft X-rays at 38 A, within the biologically important 'water window'. In this paper, we discuss the fabrication of the microscope optics and structural components as well as the mounting of the optics and assembly of the microscopes. We also describe the optical alignment, interferometric and visible light testing of the microscopes, present interferometrically measured performance data, and provide the first results of optical imaging tests.

Final Report - X-ray Studies of Highly Correlated Systems

DOE Office of Scientific and Technical Information (OSTI.GOV)

Burns, Clement

2017-11-27

The overall goal of the research was to improve the capabilities of x-ray synchrotron instrumentation to enable cutting-edge research in condensed matter physics. The main goal of the current grant cycle was to find a method to measure the polarization of the scattered x-ray in resonant inelastic x-ray scattering. To do this, we developed a polarization analysis apparatus using a thin, toroidally bent single crystal, which could be set to reflect one or the other of the two polarization components in the scattered x-ray beam. Resonant x-ray scattering measurements were also carried out on interfaces and the charge density wavemore » in high temperature superconducting materials.« less

Alternative designs for space x-ray telescopes

NASA Astrophysics Data System (ADS)

Hudec, R.; Pína, L.; Maršíková, Veronika; Černá, Daniela; Inneman, A.; Tichý, V.

2017-11-01

The X-ray optics is a key element of space X-ray telescopes, as well as other X-ray imaging instruments. The grazing incidence X-ray lenses represent the important class of X-ray optics. Most of grazing incidence (reflective) X-ray imaging systems used in astronomy but also in other (laboratory) applications are based on the Wolter 1 (or modified) arrangement. But there are also other designs and configurations proposed, used and considered for future applications both in space and in laboratory. The Kirkpatrick-Baez (K-B) lenses as well as various types of Lobster-Eye optics and MCP/Micropore optics serve as an example. Analogously to Wolter lenses, the X-rays are mostly reflected twice in these systems to create focal images. Various future projects in X-ray astronomy and astrophysics will require large segments with multiple thin shells or foils. The large Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All related space projects will require high quality and light segmented shells (bent or flat foils) with high X-ray reflectivity and excellent mechanical stability. The Multi Foil Optics (MFO) approach represent a promising alternative for both LE and K-B X-ray optical modules. Several types of reflecting substrates may be considered for these applications, with emphasis on thin float glass sheets and, more recently, high quality silicon wafers. This confirms the importance of non-Wolter X-ray optics designs for the future. The alternative designs require novel reflective substrates which are also discussed in the paper.

Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay.

PubMed

Gong, Zhiliang; Kerr, Daniel; Hwang, Hyeondo Luke; Henderson, J Michael; Suwatthee, Tiffany; Slaw, Benjamin R; Cao, Kathleen D; Lin, Binhua; Bu, Wei; Lee, Ka Yee C

2017-03-01

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared to literature results. In an air/liquid interface study, Ca 2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl 2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm 2 of interfacial area contains 2.38 ± 0.06 Ca 2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca 2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr 2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr 2+ at 68 -5 +6 Å 2 per ion, consistent with the result published for the same dataset.

Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

NASA Astrophysics Data System (ADS)

Gong, Zhiliang; Kerr, Daniel; Hwang, Hyeondo Luke; Henderson, J. Michael; Suwatthee, Tiffany; Slaw, Benjamin R.; Cao, Kathleen D.; Lin, Binhua; Bu, Wei; Lee, Ka Yee C.

2017-03-01

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared to literature results. In an air/liquid interface study, Ca2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm2 of interfacial area contains 2.38 ± 0.06 Ca2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr2+ at 68-5+6 Å2 per ion, consistent with the result published for the same dataset.

Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

DOE Office of Scientific and Technical Information (OSTI.GOV)

Gong, Zhiliang; Kerr, Daniel; Hwang, Hyeondo Luke

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared tomore » literature results. In an air/liquid interface study, Ca2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm2 of interfacial area contains 2.38 ± 0.06 Ca2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr2+ at 68+6-568-5+6 Å2 per ion, consistent with the result published for the same dataset.« less

Pump–probe spectrometer for measuring x-ray induced strain

DOE PAGES

Loether, A.; Adams, B. W.; DiCharia, A.; ...

2016-04-20

A hard x-ray pump–probe spectrometer using a multi-crystal Bragg reflector is demonstrated at a third generation synchrotron source. This device derives both broadband pump and monochromatic probe pulses directly from a single intense, broadband x-ray pulse centered at 8.767 keV. In conclusion, we present a proof-of-concept experiment which directly measures x-ray induced crystalline lattice strain.

X-ray Crystallography Facility

NASA Technical Reports Server (NTRS)

2000-01-01

Edward Snell, a National Research Council research fellow at NASA's Marshall Space Flight Center (MSFC), prepares a protein crystal for analysis by x-ray crystallography as part of NASA's structural biology program. The small, individual crystals are bombarded with x-rays to produce diffraction patterns, a map of the intensity of the x-rays as they reflect through the crystal.

[Development of X-ray Reflection Grating Technology for the Constellation-X Mission

NASA Technical Reports Server (NTRS)

Schattenburg, Mark L.

2005-01-01

This Grant supports MIT technology development of x-ray reflection gratings for the Constellation-X Reflection Grating Spectrometer (RGS). Since the start of the Grant MIT has extended its previously-developed patterning and super-smooth, blazed grating fabrication technology to ten-times smaller grating periods and ten-times larger blaze angles to demonstrate feasibility and performance in the off-plane grating geometry. In the past year we have focused our efforts on extending our Nanoruler grating fabrication tool to enable it to perform variable-period scanning-beam interference lithography (VP-SBIL). This new capability required extensive optical and mechanical improvements to the system. The design phase of this work is largely completed and key components are now on order and assembly has begun. Over the next several months the new VP-SBIL Nanoruler system will be completed and testing begun. We have also demonstrated a new technique for patterning gratings using the Nanoruler called Doppler mode, which will be important for patterning the radial groove gratings for the RGS using the new VP-SBIL system. Flat and thin grating substrates will be critical for the RGS. In the last year we demonstrated a new technique for flattening thin substrates using magneto-rheologic fluid polishing (MRF) and achieved 2 arcsecond flatness with a 0.5 mm-thick substrate-a world's record. This meets the Con X requirement for grating substrate flatness.

Analysis of coke beverages by total-reflection X-ray fluorescence

NASA Astrophysics Data System (ADS)

Fernández-Ruiz, Ramón; von Bohlen, Alex; Friedrich K, E. Josue; Redrejo, M. J.

2018-07-01

The influence of the organic content, sample preparation process and the morphology of the depositions of two types of Coke beverage, traditional and light Coke, have been investigated by mean of Total-reflection X-ray Fluorescence (TXRF) spectrometry. Strong distortions of the nominal concentration values, up to 128% for P, have been detected in the analysis of traditional Coke by different preparation methods. These differences have been correlated with the edge X-ray energies of the elements analyzed being more pronounced for the lighter elements. The influence of the organic content (mainly sugar) was evaluated comparing traditional and light Coke analytical TXRF results. Three sample preparation methods have been evaluated as follows: direct TXRF analysis of the sample only adding internal standard, TXRF analysis after open vessel acid digestion and TXRF analysis after high pressure and temperature microwave-assisted acid digestion. Strong correlations were detected between quantitative results, methods of preparation and energies of the X-ray absorption edges of quantified elements. In this way, a decay behavior for the concentration differences between preparation methods and the energies of the X-ray absorption edges of each element were observed. The observed behaviors were modeled with exponential decay functions obtaining R2 correlation coefficients from 0.989 to 0.992. The strong absorption effect observed, and even possible matrix effect, can be explained by the inherent high organic content of the evaluated samples and also by the morphology and average thickness of the TXRF depositions observed. As main conclusion of this work, the analysis of light elements in samples with high organic content by TXRF, i.e. medical, biological, food or any other organic matrixes should be taken carefully. In any case, the direct analysis is not recommended and a previous microwave-assisted acid digestion, or similar, is mandatory, for the correct elemental

Application of the Total Reflection X-ray Fluorescence technique to trace elements determination in tobacco

NASA Astrophysics Data System (ADS)

Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

2008-12-01

Many studies have identified an important number of toxic elements along with organic carcinogen molecules and radioactive isotopes in tobacco. In this work we have analyzed by Total Reflection X-Ray Fluorescence 9 brands of cigarettes being manufactured and distributed in the Mexican market. Two National Institute of Standards and Technology standards and a blank were equally treated at the same time. Results show the presence of some toxic elements such as Pb and Ni. These results are compared with available data for some foreign brands, while their implications for health are discussed. It can be confirmed that the Total Reflection X-Ray Fluorescence method provides precise (reproducible) and accuracy (trueness) data for 15 elements concentration in tobacco samples.

X-ray beam method for displacement measurement in hostile environments

NASA Technical Reports Server (NTRS)

Jordan, Eric H.; Pease, D. M.; Canistraro, H.; Brew, Dale

1989-01-01

A new method of extensometry using an X-ray beam was devised, and the results of current testing reveal it to be highly feasible. This technique has been shown to provide a non-contacting system that is immune to problems associated with density variations in gaseous environments, that plague currently available optical methods. This advantage is a result of the non-refracting penetrating nature of X-rays. The method is based on X-ray-induced X-ray fluorescence of targets, which subsequently serve as fudicial markers. Some target materials have melting points over 1600 degrees C which will facilitate measurement at extremely high temperatures. A highly focused intense X-ray beam, which is produced using a Johansen 'bent crystal', is then scanned across the target, which responds by fluorescing X-rays when stimulated by the incident beam. This secondary radiation is monitored using a detector. By carefully measuring beam orientation, change in target edge position can be determined. Many variations on this basic theme are now possible such as two targets demarcating a gage length, or a beam shadowing method using opaque targets.

Hard X-ray mirrors for Nuclear Security

DOE Office of Scientific and Technical Information (OSTI.GOV)

Descalle, M. A.; Brejnholt, N.; Hill, R.

Research performed under this LDRD aimed to demonstrate the ability to detect and measure hard X-ray emissions using multilayer X-ray reflective optics above 400 keV, to enable the development of inexpensive and high-accuracy mirror substrates, and to investigate applications of hard X-ray mirrors of interest to the nuclear security community. Experiments conducted at the European Synchrotron Radiation Facility demonstrated hard X-ray mirror reflectivity up to 650 keV for the first time. Hard X-ray optics substrates must have surface roughness under 3 to 4 Angstrom rms, and three materials were evaluated as potential substrates: polycarbonates, thin Schott glass and a newmore » type of flexible glass called Willow Glass®. Chemical smoothing and thermal heating of the surface of polycarbonate samples, which are inexpensive but have poor intrinsic surface characteristics, did not yield acceptable surface roughness. D263 Schott glass was used for the focusing optics of the NASA NuSTAR telescope. The required specialized hardware and process were costly and motivated experiments with a modified non-contact slumping technique. The surface roughness of the glass was preserved and the process yielded cylindrical shells with good net shape pointing to the potential advantage of this technique. Finally, measured surface roughness of 200 and 130 μm thick Willow Glass sheets was between 2 and 2.5 A rms. Additional results of flexibility tests and multilayer deposition campaigns indicated it is a promising substrate for hard X-ray optics. The detection of U and Pu characteristics X-ray lines and gamma emission lines in a high background environment was identified as an area for which X-ray mirrors could have an impact and where focusing optics could help reduce signal to noise ratio by focusing signal onto a smaller detector. Hence the first one twelvetant of a Wolter I focusing optics for the 90 to 140 keV energy range based on aperiodic multilayer coating was designed

The measurement capabilities of cross-sectional profile of Nanoimprint template pattern using small angle x-ray scattering

NASA Astrophysics Data System (ADS)

Yamanaka, Eiji; Taniguchi, Rikiya; Itoh, Masamitsu; Omote, Kazuhiko; Ito, Yoshiyasu; Ogata, Kiyoshi; Hayashi, Naoya

2016-05-01

Nanoimprint lithography (NIL) is one of the most potential candidates for the next generation lithography for semiconductor. It will achieve the lithography with high resolution and low cost. High resolution of NIL will be determined by a high definition template. Nanoimprint lithography will faithfully transfer the pattern of NIL template to the wafer. Cross-sectional profile of the template pattern will greatly affect the resist profile on the wafer. Therefore, the management of the cross-sectional profile is essential. Grazing incidence small angle x-ray scattering (GI-SAXS) technique has been proposed as one of the method for measuring cross-sectional profile of periodic nanostructure pattern. Incident x-rays are irradiated to the sample surface with very low glancing angle. It is close to the critical angle of the total reflection of the x-ray. The scattered x-rays from the surface structure are detected on a two-dimensional detector. The observed intensity is discrete in the horizontal (2θ) direction. It is due to the periodicity of the structure, and diffraction is observed only when the diffraction condition is satisfied. In the vertical (β) direction, the diffraction intensity pattern shows interference fringes reflected to height and shape of the structure. Features of the measurement using x-ray are that the optical constant for the materials are well known, and it is possible to calculate a specific diffraction intensity pattern based on a certain model of the cross-sectional profile. The surface structure is estimated by to collate the calculated diffraction intensity pattern that sequentially while changing the model parameters with the measured diffraction intensity pattern. Furthermore, GI-SAXS technique can be measured an object in a non-destructive. It suggests the potential to be an effective tool for product quality assurance. We have developed a cross-sectional profile measurement of quartz template pattern using GI-SAXS technique. In this

Flat field anomalies in an x-ray charge coupled device camera measured using a Manson x-ray source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Haugh, M. J.; Schneider, M. B.

2008-10-15

The static x-ray imager (SXI) is a diagnostic used at the National Ignition Facility (NIF) to measure the position of the x rays produced by lasers hitting a gold foil target. The intensity distribution taken by the SXI camera during a NIF shot is used to determine how accurately NIF can aim laser beams. This is critical to proper NIF operation. Imagers are located at the top and the bottom of the NIF target chamber. The charge coupled device (CCD) chip is an x-ray sensitive silicon sensor, with a large format array (2kx2k), 24 {mu}m square pixels, and 15 {mu}mmore » thick. A multianode Manson x-ray source, operating up to 10 kV and 10 W, was used to characterize and calibrate the imagers. The output beam is heavily filtered to narrow the spectral beam width, giving a typical resolution E/{delta}E{approx_equal}10. The x-ray beam intensity was measured using an x-ray photodiode that has an accuracy better than 1% up to the Si K edge and better than 5% at higher energies. The x-ray beam provides full CCD illumination and is flat, within {+-}1% maximum to minimum. The spectral efficiency was measured at ten energy bands ranging from 930 to 8470 eV. We observed an energy dependent pixel sensitivity variation that showed continuous change over a large portion of the CCD. The maximum sensitivity variation occurred at 8470 eV. The geometric pattern did not change at lower energies, but the maximum contrast decreased and was not observable below 4 keV. We were also able to observe debris, damage, and surface defects on the CCD chip. The Manson source is a powerful tool for characterizing the imaging errors of an x-ray CCD imager. These errors are quite different from those found in a visible CCD imager.« less

Prototyping iridium coated mirrors for x-ray astronomy

NASA Astrophysics Data System (ADS)

Döhring, Thorsten; Probst, Anne-Catherine; Stollenwerk, Manfred; Emmerich, Florian; Stehlíková, Veronika; Inneman, Adolf

2017-05-01

X-ray astronomy uses space-based telescopes to overcome the disturbing absorption of the Earth's atmosphere. The telescope mirrors are operating at grazing incidence angles and are coated with thin metal films of high-Z materials to get sufficient reflectivity for the high-energy radiation to be observed. In addition the optical payload needs to be light-weighted for launcher mass constrains. Within the project JEUMICO, an acronym for "Joint European Mirror Competence", the Aschaffenburg University of Applied Sciences and the Czech Technical University in Prague started a collaboration to develop mirrors for X-ray telescopes. The X-ray telescopes currently developed within this Bavarian- Czech project are of Lobster eye type optical design. Corresponding mirror segments use substrates of flat silicon wafers which are coated with thin iridium films, as this material is promising high reflectivity in the X-ray range of interest. The deposition of the iridium films is based on a magnetron sputtering process. Sputtering with different parameters, especially by variation of the argon gas pressure, leads to iridium films with different properties. In addition to investigations of the uncoated mirror substrates the achieved surface roughness has been studied. Occasional delamination of the iridium films due to high stress levels is prevented by chromium sublayers. Thereby the sputtering parameters are optimized in the context of the expected reflectivity of the coated X-ray mirrors. In near future measurements of the assembled mirror modules optical performances are planned at an X-ray test facility.

X-ray source development for EXAFS measurements on the National Ignition Facility.

PubMed

Coppari, F; Thorn, D B; Kemp, G E; Craxton, R S; Garcia, E M; Ping, Y; Eggert, J H; Schneider, M B

2017-08-01

Extended X-ray absorption Fine Structure (EXAFS) measurements require a bright, spectrally smooth, and broad-band x-ray source. In a laser facility, such an x-ray source can be generated by a laser-driven capsule implosion. In order to optimize the x-ray emission, different capsule types and laser irradiations have been tested at the National Ignition Facility (NIF). A crystal spectrometer is used to disperse the x-rays and high efficiency image plate detectors are used to measure the absorption spectra in transmission geometry. EXAFS measurements at the K-edge of iron at ambient conditions have been obtained for the first time on the NIF laser, and the requirements for optimization have been established.

X-Ray Measurements Of A Thermo Scientific P385 DD Neutron Generator

NASA Astrophysics Data System (ADS)

Wharton, C. J.; Seabury, E. H.; Chichester, D. L.; Caffrey, A. J.; Simpson, J.; Lemchak, M.

2011-06-01

Idaho National Laboratory is experimenting with electrical neutron generators, as potential replacements for californium-252 radioisotopic neutron sources in its PINS prompt gamma-ray neutron activation analysis (PGNAA) system for the identification of military chemical warfare agents and explosives. In addition to neutron output, we have recently measured the x-ray output of the Thermo Scientific P385 deuterium-deuterium neutron generator. X rays are a normal byproduct from neutron generators, but depending on their intensity and energy, x rays can interfere with gamma rays from the object under test, increase gamma-spectrometer dead time, and reduce PGNAA system throughput. The P385 x-ray energy spectrum was measured with a high-purity germanium (HPGe) detector, and a broad peak is evident at about 70 keV. To identify the source of the x rays within the neutron generator assembly, it was scanned by collimated scintillation detectors along its long axis. At the strongest x-ray emission points, the generator also was rotated 60° between measurements. The scans show the primary source of x-ray emission from the P385 neutron generator is an area 60 mm from the neutron production target, in the vicinity of the ion source. Rotation of the neutron generator did not significantly alter the x-ray count rate, and its x-ray emission appears to be axially symmetric. A thin lead shield, 3.2 mm (1/8 inch) thick, reduced the 70-keV generator x rays to negligible levels.

Observation of the strain field near the Si(111) 7 x 7 surface with a new X-ray diffraction technique.

PubMed

Emoto, T; Akimoto, K; Ichimiya, A

1998-05-01

A new X-ray diffraction technique has been developed in order to measure the strain field near a solid surface under ultrahigh vacuum (UHV) conditions. The X-ray optics use an extremely asymmetric Bragg-case bulk reflection. The glancing angle of the X-rays can be set near the critical angle of total reflection by tuning the X-ray energy. Using this technique, rocking curves for Si surfaces with different surface structures, i.e. a native oxide surface, a slightly oxide surface and an Si(111) 7 x 7 surface, were measured. It was found that the widths of the rocking curves depend on the surface structures. This technique is efficient in distinguishing the strain field corresponding to each surface structure.

Fat to muscle ratio measurements with dual energy x-ray absorbtiometry

DOE Office of Scientific and Technical Information (OSTI.GOV)

Chen, A.; Luo, J.; Wang, A.

Accurate measurement of the fat-to-muscle ratio in animal model is important for obesity research. In addition, an efficient way to measure the fat to muscle ratio in animal model using dual-energy absorptiometry is presented in this paper. A radioactive source exciting x-ray fluorescence from a target material is used to provide the two x-ray energies needed. The x-rays, after transmitting through the sample, are measured with an energy-sensitive Ge detector. Phantoms and specimens were measured. The results showed that the method was sensitive to the fat to muscle ratios with good linearity. A standard deviation of a few percent inmore » the fat to muscle ratio could be observed with the x-ray dose of 0.001 mGy.« less

Fat to muscle ratio measurements with dual energy x-ray absorbtiometry

DOE PAGES

Chen, A.; Luo, J.; Wang, A.; ...

2015-03-14

Accurate measurement of the fat-to-muscle ratio in animal model is important for obesity research. In addition, an efficient way to measure the fat to muscle ratio in animal model using dual-energy absorptiometry is presented in this paper. A radioactive source exciting x-ray fluorescence from a target material is used to provide the two x-ray energies needed. The x-rays, after transmitting through the sample, are measured with an energy-sensitive Ge detector. Phantoms and specimens were measured. The results showed that the method was sensitive to the fat to muscle ratios with good linearity. A standard deviation of a few percent inmore » the fat to muscle ratio could be observed with the x-ray dose of 0.001 mGy.« less

Elastohydrodynamic film thickness formula based on X-ray measurements with a synthetic paraffinic oil

NASA Technical Reports Server (NTRS)

Loewenthal, S. H.; Parker, R. J.; Zaretsky, E. V.

1973-01-01

An empirical elastohydrodynamic film thickness formula for heavily loaded contacts based upon X-ray film thickness measurements made with a synthetic paraffinic oil is presented. The deduced relation was found to adequately reflect the high load dependence exhibited by the measured minimum film thickness data at high Hertizian contact stresses, that is, above 1.04 x 10 to the ninth N/sq m (150,000 psi). Comparisons were made with the numerical results from a theoretical isothermal film thickness formula. The effects of changes in contact geometry, material, and lubricant properties on the form of the empirical model are also discussed.

Ray-trace analysis of glancing-incidence X-ray optical systems

NASA Technical Reports Server (NTRS)

Foreman, J. W., Jr.; Cardone, J. M.

1976-01-01

The results of a ray-trace analysis of several glancing-incidence X-ray optical systems are presented. The object of the study was threefold. First, the vignetting characteristics of the S-056 X-ray telescope were calculated using experimental data to determine mirror reflectivities. Second, a small Wolter Type I X-ray telescope intended for possible use in the Geostationary Operational Environmental Satellite program was designed and ray traced. Finally, a ray-trace program was developed for a Wolter-Schwarzschild X-ray telescope.

Energy dependence measurement of small-type optically stimulated luminescence (OSL) dosimeter by means of characteristic X-rays induced with general diagnostic X-ray equipment.

PubMed

Takegami, Kazuki; Hayashi, Hiroaki; Okino, Hiroki; Kimoto, Natsumi; Maehata, Itsumi; Kanazawa, Yuki; Okazaki, Tohru; Hashizume, Takuya; Kobayashi, Ikuo

2016-01-01

For X-ray inspections by way of general X-ray equipment, it is important to measure an entrance-skin dose. Recently, a small optically stimulated luminescence (OSL) dosimeter was made commercially available by Landauer, Inc. The dosimeter does not interfere with the medical images; therefore, it is expected to be a convenient detector for measuring personal exposure doses. In an actual clinical situation, it is assumed that X-rays of different energies will be detected by a dosimeter. For evaluation of the exposure dose measured by a dosimeter, it is necessary to know the energy dependence of the dosimeter. Our aim in this study was to measure the energy dependence of the OSL dosimeter experimentally in the diagnostic X-ray region. Metal samples weighing several grams were irradiated and, in this way, characteristic X-rays having energies ranging from 8 to 85 keV were generated. Using these mono-energetic X-rays, the dosimeter was irradiated. Simultaneously, the fluence of the X-rays was determined with a CdTe detector. The energy-dependent efficiency of the dosimeter was derived from the measured value of the dosimeter and the fluence. Moreover, the energy-dependent efficiency was calculated by Monte-Carlo simulation. The efficiency obtained in the experiment was in good agreement with that of the simulation. In conclusion, our proposed method, in which characteristic X-rays are used, is valuable for measurement of the energy dependence of a small OSL dosimeter in the diagnostic X-ray region.

Evaluation of the soft x-ray reflectivity of micropore optics using anisotropic wet etching of silicon wafers

DOE Office of Scientific and Technical Information (OSTI.GOV)

Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Koshiishi, Masaki

2010-02-20

The x-ray reflectivity of an ultralightweight and low-cost x-ray optic using anisotropic wet etching of Si (110) wafers is evaluated at two energies, C K{alpha}0.28 keV and Al K{alpha}1.49 keV. The obtained reflectivities at both energies are not represented by a simple planar mirror model considering surface roughness. Hence, an geometrical occultation effect due to step structures upon the etched mirror surface is taken into account. Then, the reflectivities are represented by the theoretical model. The estimated surface roughness at C K{alpha} ({approx}6 nm rms) is significantly larger than {approx}1 nm at Al K{alpha}. This can be explained by differentmore » coherent lengths at two energies.« less

Evaluation of the soft x-ray reflectivity of micropore optics using anisotropic wet etching of silicon wafers.

PubMed

Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Koshiishi, Masaki; Mita, Makoto; Maeda, Yoshitomo; Yamasaki, Noriko Y; Mitsuda, Kazuhisa; Shirata, Takayuki; Hayashi, Takayuki; Takano, Takayuki; Maeda, Ryutaro

2010-02-20

The x-ray reflectivity of an ultralightweight and low-cost x-ray optic using anisotropic wet etching of Si (110) wafers is evaluated at two energies, C K(alpha)0.28 keV and Al K(alpha)1.49 keV. The obtained reflectivities at both energies are not represented by a simple planar mirror model considering surface roughness. Hence, an geometrical occultation effect due to step structures upon the etched mirror surface is taken into account. Then, the reflectivities are represented by the theoretical model. The estimated surface roughness at C K(alpha) (approximately 6 nm rms) is significantly larger than approximately 1 nm at Al K(alpha). This can be explained by different coherent lengths at two energies.

X-ray source development for EXAFS measurements on the National Ignition Facility

DOE PAGES

Coppari, F.; Thorn, D. B.; Kemp, G. E.; ...

2017-08-28

We present that extended X-ray absorption Fine Structure (EXAFS) measurements require a bright, spectrally smooth, and broad-band x-ray source. In a laser facility, such an x-ray source can be generated by a laser-driven capsule implosion. In order to optimize the x-ray emission, different capsule types and laser irradiations have been tested at the National Ignition Facility (NIF). A crystal spectrometer is used to disperse the x-rays and high efficiency image plate detectors are used to measure the absorption spectra in transmission geometry. Finally, EXAFS measurements at the K-edge of iron at ambient conditions have been obtained for the first timemore » on the NIF laser, and the requirements for optimization have been established.« less

X-Ray Measurements Of A Thermo Scientific P385 DD Neutron Generator

DOE Office of Scientific and Technical Information (OSTI.GOV)

Wharton, C. J.; Seabury, E. H.; Chichester, D. L.

2011-06-01

Idaho National Laboratory is experimenting with electrical neutron generators, as potential replacements for californium-252 radioisotopic neutron sources in its PINS prompt gamma-ray neutron activation analysis (PGNAA) system for the identification of military chemical warfare agents and explosives. In addition to neutron output, we have recently measured the x-ray output of the Thermo Scientific P385 deuterium-deuterium neutron generator. X rays are a normal byproduct from neutron generators, but depending on their intensity and energy, x rays can interfere with gamma rays from the object under test, increase gamma-spectrometer dead time, and reduce PGNAA system throughput. The P385 x-ray energy spectrum wasmore » measured with a high-purity germanium (HPGe) detector, and a broad peak is evident at about 70 keV. To identify the source of the x rays within the neutron generator assembly, it was scanned by collimated scintillation detectors along its long axis. At the strongest x-ray emission points, the generator also was rotated 60 deg. between measurements. The scans show the primary source of x-ray emission from the P385 neutron generator is an area 60 mm from the neutron production target, in the vicinity of the ion source. Rotation of the neutron generator did not significantly alter the x-ray count rate, and its x-ray emission appears to be axially symmetric. A thin lead shield, 3.2 mm (1/8 inch) thick, reduced the 70-keV generator x rays to negligible levels.« less

Measuring Cavitation with Synchrotron X-Rays

NASA Astrophysics Data System (ADS)

Duke, Daniel; Kastengren, Alan; Powell, Chris; X-Ray Fuel Spray Group, Energy Systems Division Team

2012-11-01

Cavitation plays an important role in the formation of sprays from small nozzles such as those found in fuel injection systems. A sharp-edged inlet from the sac into the nozzle of a diesel fuel injector is shown to inititate a strong sheet-like cavitation along the boundary layer of the nozzle throat, which is difficult to measure and can lead to acoustic damage. To investigate this phenomenon, a diagnostic technique capable of mapping the density field of the nozzle through regions of intense cavitation is required. Available visible-light techniques are limited to qualitative observations of the outer extent of cavitation zones. However, brilliant X-rays from a synchrotron source have negligible refraction and are capable of penetrating the full extent of cavitation zones. We present the early results of a novel application of line-of-sight, time-resolved X-ray radiography on a cavitating model nozzle. Experiments were conducted at Sector 7-BM of the Advanced Photon Source. Density and vapor distribution are measured from the quantitative absorption of monochromatic X-rays. The density field can then be tomographically reconstructed from the projections. The density is then validated against a range of compressible and incompressible numerical simulations. This research was performed at the 7-BM beamline of the Advanced Photon Source. We acknowledge the support of the U.S. Department of Energy under Contract No. DE-AC02-06CH11357 and the DOE Vehicle Technologies Program (DOE-EERE).

New trends in space x-ray optics

NASA Astrophysics Data System (ADS)

Hudec, R.; Maršíková, V.; Pína, L.; Inneman, A.; Skulinová, M.

2017-11-01

The X-ray optics is a key element of various X-ray telescopes, X-ray microscopes, as well as other X-ray imaging instruments. The grazing incidence X-ray lenses represent the important class of X-ray optics. Most of grazing incidence (reflective) X-ray imaging systems used in astronomy but also in other (laboratory) applications are based on the Wolter 1 (or modified) arrangement. But there are also other designs and configurations proposed, used and considered for future applications both in space and in laboratory. The Kirkpatrick-Baez (K-B) lenses as well as various types of Lobster-Eye optics and MCP/Micropore optics serve as an example. Analogously to Wolter lenses, the X-rays are mostly reflected twice in these systems to create focal images. Various future projects in X-ray astronomy and astrophysics will require large segments with multiple thin shells or foils. The large Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All these space projects will require high quality and light segmented shells (bent or flat foils) with high X-ray reflectivity and excellent mechanical stability. The Multi Foil Optics (MFO) approach represent a promising alternative for both LE and K-B X-ray optical modules. Several types of reflecting substrates may be considered for these applications, with emphasis on thin float glass sheets and, more recently, high quality silicon wafers. This confirms the importance of non- Wolter X-ray optics designs for the future. Future large space X-ray telescopes (such as IXO) require precise and light-weight X-ray optics based on numerous thin reflecting shells. Novel approaches and advanced technologies are to be exploited and developed. In this contribution, we refer on results of tested X-ray mirror shells produced by glass thermal forming (GTF) and by shaping Si wafers. Both glass foils and Si wafers are commercially available, have excellent surface

Global optimization and reflectivity data fitting for x-ray multilayer mirrors by means of genetic algorithms

NASA Astrophysics Data System (ADS)

Sanchez del Rio, Manuel; Pareschi, Giovanni

2001-01-01

The x-ray reflectivity of a multilayer is a non-linear function of many parameters (materials, layer thicknesses, densities, roughness). Non-linear fitting of experimental data with simulations requires to use initial values sufficiently close to the optimum value. This is a difficult task when the space topology of the variables is highly structured, as in our case. The application of global optimization methods to fit multilayer reflectivity data is presented. Genetic algorithms are stochastic methods based on the model of natural evolution: the improvement of a population along successive generations. A complete set of initial parameters constitutes an individual. The population is a collection of individuals. Each generation is built from the parent generation by applying some operators (e.g. selection, crossover, mutation) on the members of the parent generation. The pressure of selection drives the population to include 'good' individuals. For large number of generations, the best individuals will approximate the optimum parameters. Some results on fitting experimental hard x-ray reflectivity data for Ni/C multilayers recorded at the ESRF BM5 are presented. This method could be also applied to the help in the design of multilayers optimized for a target application, like for an astronomical grazing-incidence hard X-ray telescopes.

X-ray shearing interferometer

DOEpatents

Koch, Jeffrey A [Livermore, CA

2003-07-08

An x-ray interferometer for analyzing high density plasmas and optically opaque materials includes a point-like x-ray source for providing a broadband x-ray source. The x-rays are directed through a target material and then are reflected by a high-quality ellipsoidally-bent imaging crystal to a diffraction grating disposed at 1.times. magnification. A spherically-bent imaging crystal is employed when the x-rays that are incident on the crystal surface are normal to that surface. The diffraction grating produces multiple beams which interfere with one another to produce an interference pattern which contains information about the target. A detector is disposed at the position of the image of the target produced by the interfering beams.

Innovative space x-ray telescopes

NASA Astrophysics Data System (ADS)

Hudec, R.; Inneman, A.; Pina, L.; Sveda, L.; Ticha, H.; Brozek, V.

2017-11-01

We report on the progress in innovative X-ray mirror development with focus on requirements of future X-ray astronomy space projects. Various future projects in X-ray astronomy and astrophysics will require large lightweight but highly accurate segments with multiple thin shells or foils. The large Wolter 1 grazing incidence multiple mirror arrays, the Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All these space projects will require high quality and light segmented shells (shaped, bent or flat foils) with high X-ray reflectivity and excellent mechanical stability.

Electron temperature from x-ray continuum measurements on the NIF

NASA Astrophysics Data System (ADS)

Jarrott, Leonard; Bachmann, Benjamin; Benedetti, Robin; Izumi, Nobuhiko; Khan, Shahab; Landen, Otto; Ma, Tammy; Nagel, Sabrina; Pak, Arthur; Patel, Prav; Schneider, Marilyn; Springer, Paul; LLNL Collaboration

2017-10-01

We report on measurements of the electron temperature within the hot spot of inertially confined, layered implosions on the NIF using a titanium differential filtering x-ray diagnostic. The electron temperature from x-ray emission is insensitive to non-thermal velocity flows as is the case with ion temperature measurements and is thus a critical parameter in interpreting stagnated hot spot conditions. Here we discuss measurements using titanium filters ranging from 10 μm to 1mm in thickness with a sensitivity band of 10-30keV coupled with penumbral pinholes. The use of larger pinhole diameters increases x-ray fluence improving sensitivity of photon energies with minimal attenuation from the compressed fuel/shell. This diagnostic has been fielded on a series of cryogenic shots with DT ion temperatures ranging from 2-5keV. Analysis of the measurement will be presented along with a comparison against simulated electron temperatures and x-ray spectra as well as a comparison to DT ion temperature measurements. This work was performed under the auspices of U.S. DoE by LLNL under Contract No. DE-AC52-07NA27344.

Measurement of Solid Rocket Propellant Burning Rate Using X-ray Imaging

NASA Astrophysics Data System (ADS)

Denny, Matthew D.

The burning rate of solid propellants can be difficult to measure for unusual burning surface geometries, but X-ray imaging can be used to measure burning rate. The objectives of this work were to measure the baseline burning rate of an electrically-controlled solid propellant (ESP) formulation with real-time X-ray radiography and to determine the uncertainty of the measurements. Two edge detection algorithms were written to track the burning surface in X-ray videos. The edge detection algorithms were informed by intensity profiles of simulated 2-D X-ray images. With a 95% confidence level, the burning rates measured by the Projected-Slope Intersection algorithm in the two combustion experiments conducted were 0.0839 in/s +/-2.86% at an average pressure of 407 psi +/-3.6% and 0.0882 in/s +/-3.04% at 410 psi +/-3.9%. The uncertainty percentages were based on the statistics of a Monte Carlo analysis on burning rate.

The Ultracompact Nature of the Black Hole Candidate X-Ray Binary 47 Tuc X9

NASA Technical Reports Server (NTRS)

Bahramian, Arash; Heinke, Craig O.; Tudor, Vlad; Miller-Jones, James C. A.; Bogdanov, Slavko; Maccarone, Thomas J.; Knigge, Christian; Sivakoff, Gregory R.; Chomiuk, Laura; Strader, J.;

X-ray Diffraction Crystal Calibration and Characterization

DOE Office of Scientific and Technical Information (OSTI.GOV)

Michael J. Haugh; Richard Stewart; Nathan Kugland

2009-06-05

National Security Technologies’ X-ray Laboratory is comprised of a multi-anode Manson type source and a Henke type source that incorporates a dual goniometer and XYZ translation stage. The first goniometer is used to isolate a particular spectral band. The Manson operates up to 10 kV and the Henke up to 20 kV. The Henke rotation stages and translation stages are automated. Procedures have been developed to characterize and calibrate various NIF diagnostics and their components. The diagnostics include X-ray cameras, gated imagers, streak cameras, and other X-ray imaging systems. Components that have been analyzed include filters, filter arrays, grazing incidencemore » mirrors, and various crystals, both flat and curved. Recent efforts on the Henke system are aimed at characterizing and calibrating imaging crystals and curved crystals used as the major component of an X-ray spectrometer. The presentation will concentrate on these results. The work has been done at energies ranging from 3 keV to 16 keV. The major goal was to evaluate the performance quality of the crystal for its intended application. For the imaging crystals we measured the laser beam reflection offset from the X-ray beam and the reflectivity curves. For the curved spectrometer crystal, which was a natural crystal, resolving power was critical. It was first necessary to find sources of crystals that had sufficiently narrow reflectivity curves. It was then necessary to determine which crystals retained their resolving power after being thinned and glued to a curved substrate.« less

When is one layer complete? Using simultaneous in-situ RHEED and x-ray reflectivity to map layer-by-layer thin-film oxide growth

NASA Astrophysics Data System (ADS)

Sullivan, M. C.; Ward, M. J.; Joress, H.; Gutierrez-Llorente, A.; White, A. E.; Woll, A.; Brock, J. D.

2014-03-01

The most popular tool for characterizing in situ layer-by-layer growth is Reflection High-Energy Electron Diffraction (RHEED). X-ray reflectivity can also be used to study layer-by-layer growth, as long as the incident angle of the x-rays is far from a Bragg peak. During layer-by-layer homoepitaxial growth, both the RHEED intensity and the reflected x-ray intensity will oscillate, and each complete oscillation indicates the addition of one layer of material. However, it is well documented, but not well understood, that the maxima in the RHEED intensity oscillations do not necessarily occur at the completion of a layer. In contrast, the maxima in the x-ray intensity oscillations do occur at the completion of a layer, thus the RHEED and x-ray oscillations are rarely in phase. We present our results on simultaneous in situ x-ray reflectivity and RHEED during layer-by-layer growth of SrTiO3 and discuss how to determine the completion of a layer for RHEED oscillations independent of the phase of the RHEED oscillation. Supported by DOE Office of Basic Energy Sciences Award DE-SC0001086, CHESS is supported by the NSF & NIH/NIGMS via NSF award DMR-0936384.

STRONGER REFLECTION FROM BLACK HOLE ACCRETION DISKS IN SOFT X-RAY STATES

DOE Office of Scientific and Technical Information (OSTI.GOV)

Steiner, James F.; Remillard, Ronald A.; García, Javier A.

We analyze 15,000 spectra of 29 stellar-mass black hole (BH) candidates collected over the 16 year mission lifetime of Rossi X-ray Timing Explorer using a simple phenomenological model. As these BHs vary widely in luminosity and progress through a sequence of spectral states, which we broadly refer to as hard and soft, we focus on two spectral components: the Compton power law and the reflection spectrum it generates by illuminating the accretion disk. Our proxy for the strength of reflection is the equivalent width of the Fe–K line as measured with respect to the power law. A key distinction ofmore » our work is that for all states we estimate the continuum under the line by excluding the thermal disk component and using only the component that is responsible for fluorescing the Fe–K line, namely, the Compton power law. We find that reflection is several times more pronounced (∼3) in soft compared to hard spectral states. This is most readily caused by the dilution of the Fe line amplitude from Compton scattering in the corona, which has a higher optical depth in hard states. Alternatively, this could be explained by a more compact corona in soft (compared to hard) states, which would result in a higher reflection fraction.« less

JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants

NASA Astrophysics Data System (ADS)

Ingerle, D.; Pepponi, G.; Meirer, F.; Wobrauschek, P.; Streli, C.

2016-04-01

Grazing incidence XRF (GIXRF) is a very surface sensitive, nondestructive analytical tool making use of the phenomenon of total external reflection of X-rays on smooth polished surfaces. In recent years the method experienced a revival, being a powerful tool for process analysis and control in the fabrication of semiconductor based devices. Due to the downscaling of the process size for semiconductor devices, junction depths as well as layer thicknesses are reduced to a few nanometers, i.e. the length scale where GIXRF is highly sensitive. GIXRF measures the X-ray fluorescence induced by an X-ray beam incident under varying grazing angles and results in angle dependent intensity curves. These curves are correlated to the layer thickness, depth distribution and mass density of the elements in the sample. But the evaluation of these measurements is ambiguous with regard to the exact distribution function for the implants as well as for the thickness and density of nanometer-thin layers. In order to overcome this ambiguity, GIXRF can be combined with X-ray reflectometry (XRR). This is straightforward, as both techniques use similar measurement procedures and the same fundamental physical principles can be used for a combined data evaluation strategy. Such a combined analysis removes ambiguities in the determined physical properties of the studied sample and, being a correlative spectroscopic method, also significantly reduces experimental uncertainties of the individual techniques. In this paper we report our approach to a correlative data analysis, based on a concurrent calculation and fitting of simultaneously recorded GIXRF and XRR data. Based on this approach we developed JGIXA (Java Grazing Incidence X-ray Analysis), a multi-platform software package equipped with a user-friendly graphic user interface (GUI) and offering various optimization algorithms. Software and data evaluation approach were benchmarked by characterizing metal and metal oxide layers on

The Noninvasive Measurement of X-Ray Tube Potential.

NASA Astrophysics Data System (ADS)

Ranallo, Frank Nunzio

In this thesis I briefly describe the design of clinical x-ray imaging systems and also the various methods of measuring x-ray tube potential, both invasive and noninvasive. I also discuss the meaning and usage of the quantities tube potential (kV) and peak tube potential (kVp) with reference to x-ray systems used in medical imaging. I propose that there exist several quantities which describe different important aspects of the tube potential as a function of time. These quantities are measurable and can be well defined. I have developed a list of definitions of these quantities along with suggested names and symbols. I describe the development and physical principles of a superior noninvasive method of tube potential measurement along with the instrumentation used to implement this method. This thesis research resulted in the development of several commercial kVp test devices (or "kVp Meters") for which the actual measurement procedure is simple, rapid, and reliable compared to other methods, invasive or noninvasive. These kVp test devices provide measurements with a high level of accuracy and reliability over a wide range of test conditions. They provide results which are more reliable and clinically meaningful than many other, more primary and invasive methods. The errors inherent in these new kVp test devices were investigated and methods to minimize them are discussed.

Measuring X-Ray Polarization in the Presence of Systematic Effects: Known Background

NASA Technical Reports Server (NTRS)

Elsner, Ronald F.; O'Dell, Stephen L.; Weisskopf, Martin C.

2012-01-01

The prospects for accomplishing x-ray polarization measurements of astronomical sources have grown in recent years, after a hiatus of more than 37 years. Unfortunately, accompanying this long hiatus has been some confusion over the statistical uncertainties associated with x-ray polarization measurements of these sources. We have initiated a program to perform the detailed calculations that will offer insights into the uncertainties associated with x-ray polarization measurements. Here we describe a mathematical formalism for determining the 1- and 2-parameter errors in the magnitude and position angle of x-ray (linear) polarization in the presence of a (polarized or unpolarized) background. We further review relevant statistics including clearly distinguishing between the Minimum Detectable Polarization (MDP) and the accuracy of a polarization measurement.

Direct measurement of clinical mammographic x-ray spectra using a CdTe spectrometer.

PubMed

Santos, Josilene C; Tomal, Alessandra; Furquim, Tânia A; Fausto, Agnes M F; Nogueira, Maria S; Costa, Paulo R

2017-07-01

To introduce and evaluate a method developed for the direct measurement of mammographic x-ray spectra using a CdTe spectrometer. The assembly of a positioning system and the design of a simple and customized alignment device for this application is described. A positioning system was developed to easily and accurately locate the CdTe detector in the x-ray beam. Additionally, an alignment device to line up the detector with the central axis of the radiation beam was designed. Direct x-ray spectra measurements were performed in two different clinical mammography units and the measured x-ray spectra were compared with computer-generated spectra. In addition, the spectrometer misalignment effect was evaluated by comparing the measured spectra when this device is aligned relatively to when it is misaligned. The positioning and alignment of the spectrometer have allowed the measurements of direct mammographic x-ray spectra in agreement with computer-generated spectra. The most accurate x-ray spectral shape, related with the minimal HVL value, and high photon fluence for measured spectra was found with the spectrometer aligned according to the proposed method. The HVL values derived from both simulated and measured x-ray spectra differ at most 1.3 and 4.5% for two mammography devices evaluated in this study. The experimental method developed in this work allows simple positioning and alignment of a spectrometer for x-ray spectra measurements given the geometrical constraints and maintenance of the original configurations of mammography machines. © 2017 American Association of Physicists in Medicine.

A compact x-ray system for two-phase flow measurement

NASA Astrophysics Data System (ADS)

Song, Kyle; Liu, Yang

2018-02-01

In this paper, a compact x-ray densitometry system consisting of a 50 kV, 1 mA x-ray tube and several linear detector arrays is developed for two-phase flow measurement. The system is capable of measuring void fraction and velocity distributions with a spatial resolution of 0.4 mm per pixel and a frequency of 1000 Hz. A novel measurement model has been established for the system which takes account of the energy spectrum of x-ray photons and the beam hardening effect. An improved measurement accuracy has been achieved with this model compared with the conventional log model that has been widely used in the literature. Using this system, void fraction and velocity distributions are measured for a bubbly and a slug flow in a 25.4 mm I.D. air-water two-phase flow test loop. The measured superficial gas velocities show an error within  ±4% when compared with the gas flowmeter for both conditions.

X-ray luminescence computed tomography using a focused x-ray beam.

PubMed

Zhang, Wei; Lun, Michael C; Nguyen, Alex Anh-Tu; Li, Changqing

2017-11-01

Due to the low x-ray photon utilization efficiency and low measurement sensitivity of the electron multiplying charge coupled device camera setup, the collimator-based narrow beam x-ray luminescence computed tomography (XLCT) usually requires a long measurement time. We, for the first time, report a focused x-ray beam-based XLCT imaging system with measurements by a single optical fiber bundle and a photomultiplier tube (PMT). An x-ray tube with a polycapillary lens was used to generate a focused x-ray beam whose x-ray photon density is 1200 times larger than a collimated x-ray beam. An optical fiber bundle was employed to collect and deliver the emitted photons on the phantom surface to the PMT. The total measurement time was reduced to 12.5 min. For numerical simulations of both single and six fiber bundle cases, we were able to reconstruct six targets successfully. For the phantom experiment, two targets with an edge-to-edge distance of 0.4 mm and a center-to-center distance of 0.8 mm were successfully reconstructed by the measurement setup with a single fiber bundle and a PMT. (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).

X ray imaging microscope for cancer research

NASA Technical Reports Server (NTRS)

Hoover, Richard B.; Shealy, David L.; Brinkley, B. R.; Baker, Phillip C.; Barbee, Troy W., Jr.; Walker, Arthur B. C., Jr.

1991-01-01

The NASA technology employed during the Stanford MSFC LLNL Rocket X Ray Spectroheliograph flight established that doubly reflecting, normal incidence multilayer optics can be designed, fabricated, and used for high resolution x ray imaging of the Sun. Technology developed as part of the MSFC X Ray Microscope program, showed that high quality, high resolution multilayer x ray imaging microscopes are feasible. Using technology developed at Stanford University and at the DOE Lawrence Livermore National Laboratory (LLNL), Troy W. Barbee, Jr. has fabricated multilayer coatings with near theoretical reflectivities and perfect bandpass matching for a new rocket borne solar observatory, the Multi-Spectral Solar Telescope Array (MSSTA). Advanced Flow Polishing has provided multilayer mirror substrates with sub-angstrom (rms) smoothnesss for the astronomical x ray telescopes and x ray microscopes. The combination of these important technological advancements has paved the way for the development of a Water Window Imaging X Ray Microscope for cancer research.

Laser plasma x-ray source for ultrafast time-resolved x-ray absorption spectroscopy

DOE PAGES

Miaja-Avila, L.; O'Neil, G. C.; Uhlig, J.; ...

2015-03-02

We describe a laser-driven x-ray plasma source designed for ultrafast x-ray absorption spectroscopy. The source is comprised of a 1 kHz, 20 W, femtosecond pulsed infrared laser and a water target. We present the x-ray spectra as a function of laser energy and pulse duration. Additionally, we investigate the plasma temperature and photon flux as we vary the laser energy. We obtain a 75 μm FWHM x-ray spot size, containing ~10 6 photons/s, by focusing the produced x-rays with a polycapillary optic. Since the acquisition of x-ray absorption spectra requires the averaging of measurements from >10 7 laser pulses, wemore » also present data on the source stability, including single pulse measurements of the x-ray yield and the x-ray spectral shape. In single pulse measurements, the x-ray flux has a measured standard deviation of 8%, where the laser pointing is the main cause of variability. Further, we show that the variability in x-ray spectral shape from single pulses is low, thus justifying the combining of x-rays obtained from different laser pulses into a single spectrum. Finally, we show a static x-ray absorption spectrum of a ferrioxalate solution as detected by a microcalorimeter array. Altogether, our results demonstrate that this water-jet based plasma source is a suitable candidate for laboratory-based time-resolved x-ray absorption spectroscopy experiments.« less

Development of X-ray CCD camera based X-ray micro-CT system

NASA Astrophysics Data System (ADS)

Sarkar, Partha S.; Ray, N. K.; Pal, Manoj K.; Baribaddala, Ravi; Agrawal, Ashish; Kashyap, Y.; Sinha, A.; Gadkari, S. C.

2017-02-01

Availability of microfocus X-ray sources and high resolution X-ray area detectors has made it possible for high resolution microtomography studies to be performed outside the purview of synchrotron. In this paper, we present the work towards the use of an external shutter on a high resolution microtomography system using X-ray CCD camera as a detector. During micro computed tomography experiments, the X-ray source is continuously ON and owing to the readout mechanism of the CCD detector electronics, the detector registers photons reaching it during the read-out period too. This introduces a shadow like pattern in the image known as smear whose direction is defined by the vertical shift register. To resolve this issue, the developed system has been incorporated with a synchronized shutter just in front of the X-ray source. This is positioned in the X-ray beam path during the image readout period and out of the beam path during the image acquisition period. This technique has resulted in improved data quality and hence the same is reflected in the reconstructed images.

Total-reflection X-ray fluorescence studies of trace elements in biomedical samples

NASA Astrophysics Data System (ADS)

Kubala-Kukuś, A.; Braziewicz, J.; Pajek, M.

2004-08-01

Application of the total-reflection X-ray fluorescence (TXRF) analysis in the studies of trace element contents in biomedical samples is discussed in the following aspects: (i) a nature of trace element concentration distributions, (ii) censoring approach to the detection limits, and (iii) a comparison of two sets of censored data. The paper summarizes the recent results achieved in this topics, in particular, the lognormal, or more general logstable, nature of concentration distribution of trace elements, the random left-censoring and the Kaplan-Meier approach accounting for detection limits and, finally, the application of the logrank test to compare the censored concentrations measured for two groups. These new aspects, which are of importance for applications of the TXRF in different fields, are discussed here in the context of TXRF studies of trace element in various samples of medical interest.

Optical and X-ray studies of Compact X-ray Binaries in NGC 5904

NASA Astrophysics Data System (ADS)

Bhalotia, Vanshree; Beck-Winchatz, Bernhard

2018-06-01

Due to their high stellar densities, globular cluster systems trigger various dynamical interactions, such as the formation of compact X-ray binaries. Stellar collisional frequencies have been correlated to the number of X-ray sources detected in various clusters and we hope to measure this correlation for NGC 5904. Optical fluxes of sources from archival HST images of NGC 5904 have been measured using a DOLPHOT PSF photometry in the UV, optical and near-infrared. We developed a data analysis pipeline to process the fluxes of tens of thousands of objects using awk, python and DOLPHOT. We plot color magnitude diagrams in different photometric bands in order to identify outliers that could be X-ray binaries, since they do not evolve the same way as singular stars. Aligning previously measured astrometric data for X-ray sources in NGC 5904 from Chandra with archival astrometric data from HST will filter out the outlier objects that are not X-ray producing, and provide a sample of compact binary systems that are responsible for X-ray emission in NGC 5904. Furthermore, previously measured X-ray fluxes of NGC 5904 from Chandra have also been used to measure the X-ray to optical flux ratio and identify the types of compact X-ray binaries responsible for the X-ray emissions in NGC 5904. We gratefully acknowledge the support from the Illinois Space Grant Consortium.

Few-femtosecond time-resolved measurements of X-ray free-electron lasers.

PubMed

Behrens, C; Decker, F-J; Ding, Y; Dolgashev, V A; Frisch, J; Huang, Z; Krejcik, P; Loos, H; Lutman, A; Maxwell, T J; Turner, J; Wang, J; Wang, M-H; Welch, J; Wu, J

2014-04-30

X-ray free-electron lasers, with pulse durations ranging from a few to several hundred femtoseconds, are uniquely suited for studying atomic, molecular, chemical and biological systems. Characterizing the temporal profiles of these femtosecond X-ray pulses that vary from shot to shot is not only challenging but also important for data interpretation. Here we report the time-resolved measurements of X-ray free-electron lasers by using an X-band radiofrequency transverse deflector at the Linac Coherent Light Source. We demonstrate this method to be a simple, non-invasive technique with a large dynamic range for single-shot electron and X-ray temporal characterization. A resolution of less than 1 fs root mean square has been achieved for soft X-ray pulses. The lasing evolution along the undulator has been studied with the electron trapping being observed as the X-ray peak power approaches 100 GW.

Impulsive solar X-ray bursts. 4: Polarization, directivity and spectrum of the reflected and total bremsstrahlung radiation from a beam of electrons directed toward the photosphere

NASA Technical Reports Server (NTRS)

Langer, S. H.; Petrosian, V.

1976-01-01

A Monte Carlo method is described for evaluation of the spectrum, directivity and polarization of X-rays diffusely reflected from stellar photospheres. the accuracy of the technique is evaluated through comparison with analytic results. Using the characteristics of the incident X-rays of the model for solar X-ray flares, the spectrum, directivity and polarization of the reflected and the total X-ray fluxes are evaluated. The results are compared with observations.

Micromirror-based manipulation of synchrotron x-ray beams

NASA Astrophysics Data System (ADS)

Walko, D. A.; Chen, Pice; Jung, I. W.; Lopez, D.; Schwartz, C. P.; Shenoy, G. K.; Wang, Jin

2017-08-01

Synchrotron beamlines typically use macroscopic, quasi-static optics to manipulate x-ray beams. We present the use of dynamic microelectromechanical systems-based optics (MEMS) to temporally modulate synchrotron x-ray beams. We demonstrate this concept using single-crystal torsional MEMS micromirrors oscillating at frequencies of 75 kHz. Such a MEMS micromirror, with lateral dimensions of a few hundred micrometers, can interact with x rays by operating in grazing-incidence reflection geometry; x rays are deflected only when an x-ray pulse is incident on the rotating micromirror under appropriate conditions, i.e., at an angle less than the critical angle for reflectivity. The time window for such deflections depends on the frequency and amplitude of the MEMS rotation. We demonstrate that reflection geometry can produce a time window of a few microseconds. We further demonstrate that MEMS optics can isolate x rays from a selected synchrotron bunch or group of bunches. With ray-trace simulations we explain the currently achievable time windows and suggest a path toward improvements.

Higher-harmonics suppressor for soft x rays

DOE Office of Scientific and Technical Information (OSTI.GOV)

Waki, I.; Hirai, Y.; Momose, A.

We have developed an apparatus for suppressing higher harmonics contained in the soft x-ray output beam of grazing-incidence grating monochromators. It consists of eight pairs of total-reflection mirrors. Each pair serves as a low-pass filter with the cutoff energy different from one another. The eight pairs are designed to cover an energy range of 80--1600 eV with an efficiency of harmonic suppression better than 97%, while transmitting more than 50% of the fundamental photons. We have tested its preliminary performance on the soft x-ray beamline BL-8A at the Photon Factory. We present the observed transmission efficiencies and the effects ofmore » the harmonic suppressor on measurements of reflectivity and fluorescence spectra.« less

Femtosecond Optical and X-Ray Measurement of the Semiconductor-to-Metal Transition in VO2

NASA Astrophysics Data System (ADS)

Cavalleri, Andrea; Toth, Csaba; Squier, Jeff; Siders, Craig; Raksi, Ferenc; Forget, Patrick; Kieffer, Jean-Claude

2001-03-01

While the use of ultrashort visible pulses allows access to ultrafast changes in the optical properties during phase transitions, measurement of the correlation between atomic movement and electronic rearrangement has proven more elusive. Here, we report on the conjunct measurement of ultrafast electronic and structural dynamics during a semiconductor-to-metal phase transition in VO2. Rearrangement of the unit cell from monoclinic to rutile (measured by ultrafast x-ray diffraction) is accompanied by a sharp increase in the electrical conductivity and perturbation of the optical properties (measured with ultrafast visible spectroscopy). Ultrafast x-ray diffraction experiments were performed using femtosecond bursts of Cu-Ka from a laser generated plasma source. A clear rise of the diffraction signal originating from the impulsively generated metallic phase was observable on the sub-picosecond timescale. Optical experiments were performed using time-resolved microscopy, providing temporally and spatially resolved measurements of the optical reflectivity at 800 nm. The data indicate that the reflectivity of the low-temperature semiconducting solid is driven to that of the equilibrium, high-temperature metallic phase within 400 fs after irradiation with a 50-fs laser pulse at fluences in excess of 10 mJ/cm2. In conclusion, the data presented in this contribution suggest that the semiconductor-to-metal transition in VO2 occurs within 500 fs after laser-irradiation. A nonthermal physical mechanism governs the re-arrangement.

X-ray lithography using holographic images

DOEpatents

Howells, M.S.; Jacobsen, C.

1997-03-18

Methods for forming X-ray images having 0.25 {micro}m minimum line widths on X-ray sensitive material are presented. A holographic image of a desired circuit pattern is projected onto a wafer or other image-receiving substrate to allow recording of the desired image in photoresist material. In one embodiment, the method uses on-axis transmission and provides a high flux X-ray source having modest monochromaticity and coherence requirements. A layer of light-sensitive photoresist material on a wafer with a selected surface is provided to receive the image(s). The hologram has variable optical thickness and variable associated optical phase angle and amplitude attenuation for transmission of the X-rays. A second embodiment uses off-axis holography. The wafer receives the holographic image by grazing incidence reflection from a hologram printed on a flat metal or other highly reflecting surface or substrate. In this second embodiment, an X-ray beam with a high degree of monochromaticity and spatial coherence is required. 15 figs.

X-ray lithography using holographic images

DOEpatents

Howells, Malcolm S.; Jacobsen, Chris

1997-01-01

Methods for forming X-ray images having 0.25 .mu.m minimum line widths on X-ray sensitive material are presented. A holgraphic image of a desired circuit pattern is projected onto a wafer or other image-receiving substrate to allow recording of the desired image in photoresist material. In one embodiment, the method uses on-axis transmission and provides a high flux X-ray source having modest monochromaticity and coherence requirements. A layer of light-sensitive photoresist material on a wafer with a selected surface is provided to receive the image(s). The hologram has variable optical thickness and variable associated optical phase angle and amplitude attenuation for transmission of the X-rays. A second embodiment uses off-axis holography. The wafer receives the holographic image by grazing incidence reflection from a hologram printed on a flat metal or other highly reflecting surface or substrate. In this second embodiment, an X-ray beam with a high degree of monochromaticity and spatial coherence is required.

Elemental concentration analysis in prostate tissues using total reflection X-ray fluorescence

NASA Astrophysics Data System (ADS)

Leitão, R. G.; Palumbo, A.; Souza, P. A. V. R.; Pereira, G. R.; Canellas, C. G. L.; Anjos, M. J.; Nasciutti, L. E.; Lopes, R. T.

2014-02-01

Prostate cancer (PCa) currently represents the second most prevalent malignant neoplasia in men, representing 21% of all cancer cases. Benign Prostate Hyperplasia (BPH) is an illness prevailing in men above the age of 50, close to 90% after the age of 80. The prostate presents a high zinc concentration, about 10-fold higher than any other body tissue. In this work, samples of human prostate tissues with cancer, BPH and normal tissue were analyzed utilizing total reflection X-ray fluorescence spectroscopy using synchrotron radiation technique (SR-TXRF) to investigate the differences in the elemental concentrations in these tissues. SR-TXRF analyses were performed at the X-ray fluorescence beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, São Paulo. It was possible to determine the concentrations of the following elements: P, S, K, Ca, Fe, Cu, Zn and Rb. By using Mann-Whitney U test it was observed that almost all elements presented concentrations with significant differences (α=0.05) between the groups studied.

Stellar wind measurements for Colliding Wind Binaries using X-ray observations

NASA Astrophysics Data System (ADS)

Sugawara, Yasuharu; Maeda, Yoshitomo; Tsuboi, Yohko

2017-11-01

We report the results of the stellar wind measurement for two colliding wind binaries. The X-ray spectrum is the best measurement tool for the hot postshock gas. By monitoring the changing of the the X-ray luminosity and column density along with the orbital phases, we derive the mass-loss rates of these stars.

X-Ray Absorption Measured in the Resonant Auger Scattering Mode

DOE Office of Scientific and Technical Information (OSTI.GOV)

Hikosaka, Y.; Shigemasa, E.; Kaneyasu, T.

2008-08-15

We report both experimental and theoretical studies on x-ray absorption measured in the resonant Auger scattering mode of gas phase carbon monoxide near the O1s{yields}2{pi} region. Both experiment and theory display a crucial difference between the x-ray absorption profiles obtained in the conventional and resonant scattering modes. Lifetime vibrational interference is the main source of the difference. It is demonstrated that such interference, which arises from a coherent excitation to overlapping intermediate levels, ruins the idea for obtaining x-ray absorption spectra in a lifetime broadening free regime.

Cluster Masses Derived from X-ray and Sunyaev-Zeldovich Effect Measurements

NASA Technical Reports Server (NTRS)

Laroque, S.; Joy, Marshall; Bonamente, M.; Carlstrom, J.; Dawson, K.

2003-01-01

We infer the gas mass and total gravitational mass of 11 clusters using two different methods; analysis of X-ray data from the Chandra X-ray Observatory and analysis of centimeter-wave Sunyaev-Zel'dovich Effect (SZE) data from the BIMA and OVRO interferometers. This flux-limited sample of clusters from the BCS cluster catalogue was chosen so as to be well above the surface brightness limit of the ROSAT All Sky Survey; this is therefore an orientation unbiased sample. The gas mass fraction, f_g, is calculated for each cluster using both X-ray and SZE data, and the results are compared at a fiducial radius of r_500. Comparison of the X-ray and SZE results for this orientation unbiased sample allows us to constrain cluster systematics, such as clumping of the intracluster medium. We derive an upper limit on Omega_M assuming that the mass composition of clusters within r_500 reflects the universal mass composition Omega_M h_100 is greater than Omega _B / f-g. We also demonstrate how the mean f_g derived from the sample can be used to estimate the masses of clusters discovered by upcoming deep SZE surveys.

On the Determination of the Spin of the Black Hole in Cyg X-1 from X-Ray Reflection Spectra

NASA Technical Reports Server (NTRS)

Fabian, A. C.; Wilkins, D.; Miller, J. M.; Reis, R. C.; Reynolds, C. S.; Cackett, E. M.; Nowak, M. A.; Pooley, G.; Pottschmidt, K.; Sanders, J. S.;

Control x-ray deformable mirrors with few measurements

NASA Astrophysics Data System (ADS)

Huang, Lei; Xue, Junpeng; Idir, Mourad

2016-09-01

After years of development from a concept to early experimental stage, X-ray Deformable Mirrors (XDMs) are used in many synchrotron/free-electron laser facilities as a standard x-ray optics tool. XDM is becoming an integral part of the present and future large x-ray and EUV projects and will be essential in exploiting the full potential of the new sources currently under construction. The main objective of using XDMs is to correct wavefront errors or to enable variable focus beam sizes at the sample. Due to the coupling among the N actuators of a DM, it is usually necessary to perform a calibration or training process to drive the DM into the target shape. Commonly, in order to optimize the actuators settings to minimize slope/height errors, an initial measurement need to be collected, with all actuators set to 0, and then either N or 2N measurements are necessary learn each actuator behavior sequentially. In total, it means that N+1 or 2N+1 scans are required to perform this learning process. When the actuators number N is important and the actuator response or the necessary metrology is slow then this learning process can be time consuming. In this work, we present a fast and accurate method to drive an x-ray active bimorph mirror to a target shape with only 3 or 4 measurements. Instead of sequentially measuring and calculating the influence functions of all actuators and then predicting the voltages needed for any desired shape, the metrology data are directly used to "guide" the mirror from its current status towards the particular target slope/height via iterative compensations. The feedback for the iteration process is the discrepancy in curvature calculated by using B-spline fitting of the measured height/slope data. In this paper, the feasibility of this simple and effective approach is demonstrated with experiments.

A simultaneous multiple angle-wavelength dispersive X-ray reflectometer using a bent-twisted polychromator crystal

PubMed Central

Matsushita, Tadashi; Arakawa, Etsuo; Voegeli, Wolfgang; Yano, Yohko F.

2013-01-01

An X-ray reflectometer has been developed, which can simultaneously measure the whole specular X-ray reflectivity curve with no need for rotation of the sample, detector or monochromator crystal during the measurement. A bent-twisted crystal polychromator is used to realise a convergent X-ray beam which has continuously varying energy E (wavelength λ) and glancing angle α to the sample surface as a function of horizontal direction. This convergent beam is reflected in the vertical direction by the sample placed horizontally at the focus and then diverges horizontally and vertically. The normalized intensity distribution of the reflected beam measured downstream of the specimen with a two-dimensional pixel array detector (PILATUS 100K) represents the reflectivity curve. Specular X-ray reflectivity curves were measured from a commercially available silicon (100) wafer, a thin gold film coated on a silicon single-crystal substrate and the surface of liquid ethylene glycol with data collection times of 0.01 to 1000 s using synchrotron radiation from a bending-magnet source of a 6.5 GeV electron storage ring. A typical value of the simultaneously covered range of the momentum transfer was 0.01–0.45 Å−1 for the silicon wafer sample. The potential of this reflectometer for time-resolved X-ray studies of irreversible structural changes is discussed. PMID:23254659

Multi-Spectral Solar Telescope Array. II - Soft X-ray/EUV reflectivity of the multilayer mirrors

NASA Technical Reports Server (NTRS)

Barbee, Troy W., Jr.; Weed, J. W.; Hoover, Richard B.; Allen, Maxwell J.; Lindblom, Joakim F.; O'Neal, Ray H.; Kankelborg, Charles C.; Deforest, Craig E.; Paris, Elizabeth S.; Walker, Arthur B. C., Jr.

1991-01-01

The Multispectral Solar Telescope Array is a rocket-borne observatory which encompasses seven compact soft X-ray/EUV, multilayer-coated, and two compact far-UV, interference film-coated, Cassegrain and Ritchey-Chretien telescopes. Extensive measurements are presented on the efficiency and spectral bandpass of the X-ray/EUV telescopes. Attention is given to systematic errors and measurement errors.

Fabrication of imaging X-ray optics

NASA Astrophysics Data System (ADS)

Catura, R. C.; Joki, E. G.; Brookover, W. J.

The design, fabrication, and performance of optics for X-ray astronomy and laboratory applications are described and illustrated with diagrams, drawings, graphs, photographs, and sample images. Particular attention is given to the Wolter I telescope developed for spectroscopic observation of 8-30-A cosmic X-ray sources from a rocketborne X-ray Objective Grating Spectrometer; this instrument employs three nested paraboloid-hyperboloid mirrors of 5083 Al alloy, figured by diamond turning and covered with a thin coating of acrylic lacquer prior to deposition of a 40-nm-thick layer of Sn. In calibration tests at NASA Marshall, the FWHM of the line-spread function at 1.33 nm was found to be 240 microns, corresponding to 21 arcsec. Also presented are the results of reflectivity measurements on C and W multilayers sputtered on Si and fusion glass substrates.

RefleX: X-ray absorption and reflection in active galactic nuclei for arbitrary geometries

NASA Astrophysics Data System (ADS)

Paltani, S.; Ricci, C.

2017-11-01

Reprocessed X-ray radiation carries important information about the structure and physical characteristics of the material surrounding the supermassive black hole (SMBH) in active galactic nuclei (AGN). We report here on a newly developed simulation platform, RefleX, which allows to reproduce absorption and reflection by quasi-arbitrary geometries. We show here the reliability of our approach by comparing the results of our simulations with existing spectral models such as pexrav, MYTorus and BNTorus. RefleX implements both Compton scattering on free electrons and Rayleigh scattering and Compton scattering on bound electrons. We show the effect of bound-electron corrections on a torus geometry simulated like in MYTorus. We release with this paper the RefleX executable, as well as RXTorus, a model that assumes absorption and reflection from a torus with a varying ratio of the minor to major axis of the torus. To allow major flexibility RXTorus is also distributed in three components: absorbed primary emission, scattered radiation and fluorescent lines. RXTorus is provided for different values of the abundance, and with (atomic configuration) or without (free-electron configuration) taking into account Rayleigh scattering and bound electrons. We apply the RXTorus model in both configurations on the XMM-Newton and NuSTAR spectrum of the Compton-thick AGN NGC 424 and find that the models are able to reproduce very well the observations, but that the assumption on the bound or free state of the electrons has significant consequences on the fit parameters. RefleX executable, user manual and example models are available at http://www.astro.unige.ch/reflex. A copy of the RefleX executable is also available at the CDS via anonymous ftp to http://cdsarc.u-strasbg.fr (http://130.79.128.5) or via http://cdsarc.u-strasbg.fr/viz-bin/qcat?J/A+A/607/A31

Characterization of Scintillating X-ray Optical Fiber Sensors

PubMed Central

Sporea, Dan; Mihai, Laura; Vâţă, Ion; McCarthy, Denis; O'Keeffe, Sinead; Lewis, Elfed

2014-01-01

The paper presents a set of tests carried out in order to evaluate the design characteristics and the operating performance of a set of six X-ray extrinsic optical fiber sensors. The extrinsic sensor we developed is intended to be used as a low energy X-ray detector for monitoring radiation levels in radiotherapy, industrial applications and for personnel dosimetry. The reproducibility of the manufacturing process and the characteristics of the sensors were assessed. The sensors dynamic range, linearity, sensitivity, and reproducibility are evaluated through radioluminescence measurements, X-ray fluorescence and X-ray imaging investigations. Their response to the operating conditions of the excitation source was estimated. The effect of the sensors design and implementation, on the collecting efficiency of the radioluminescence signal was measured. The study indicated that the sensors are efficient only in the first 5 mm of the tip, and that a reflective coating can improve their response. Additional tests were done to investigate the concentricity of the sensors tip against the core of the optical fiber guiding the optical signal. The influence of the active material concentration on the sensor response to X-ray was studied. The tests were carried out by measuring the radioluminescence signal with an optical fiber spectrometer and with a Multi-Pixel Photon Counter. PMID:24556676

Methods for reducing singly reflected rays on the Wolter-I focusing mirrors of the FOXSI rocket experiment

NASA Astrophysics Data System (ADS)

Buitrago-Casas, Juan Camilo; Elsner, Ronald; Glesener, Lindsay; Christe, Steven; Ramsey, Brian; Courtade, Sasha; Ishikawa, Shin-nosuke; Narukage, Noriyuki; Turin, Paul; Vievering, Juliana; Athiray, P. S.; Musset, Sophie; Krucker, Säm.

2017-08-01

In high energy solar astrophysics, imaging hard X-rays by direct focusing offers higher dynamic range and greater sensitivity compared to past techniques that used indirect imaging. The Focusing Optics X-ray Solar Imager (FOXSI) is a sounding rocket payload that uses seven sets of nested Wolter-I figured mirrors together with seven high-sensitivity semiconductor detectors to observe the Sun in hard X-rays through direct focusing. The FOXSI rocket has successfully flown twice and is funded to fly a third time in summer 2018. The Wolter-I geometry consists of two consecutive mirrors, one paraboloid and one hyperboloid, that reflect photons at grazing angles. Correctly focused X-rays reflect once per mirror segment. For extended sources, like the Sun, off-axis photons at certain incident angles can reflect on only one mirror and still reach the focal plane, generating a background pattern of singly reflected rays (i.e., ghost rays) that can limit the sensitivity of the observation to faint, focused sources. Understanding and mitigating the impact of the singly reflected rays on the FOXSI optical modules will maximize the instruments' sensitivity to background-limited sources. We present an analysis of the FOXSI singly reflected rays based on ray-tracing simulations and laboratory measurements, as well as the effectiveness of different physical strategies to reduce them.

X-ray Measurements of a Thermo Scientific P385 DD Neutron Generator

DOE Office of Scientific and Technical Information (OSTI.GOV)

E.H. Seabury; D.L. Chichester; A.J. Caffrey

2001-08-01

Idaho National Laboratory is experimenting with electrical neutron generators, as potential replacements for californium-252 radioisotopic neutron sources in its PINS prompt gamma-ray neutron activation analysis (PGNAA) system for the identification of military chemical warfare agents and explosives. In addition to neutron output, we have recently measured the x-ray output of the Thermo Scientific P385 deuterium-deuterium neutron generator. X-rays are a normal byproduct from a neutron generator and depending on their intensity and energy they can interfere with gamma rays from the object under test, increase gamma-spectrometer dead time, and reduce PGNAA system throughput. The P385 x-ray energy spectrum was measuredmore » with a high-purity germanium (HPGe) detector, and a broad peak is evident at about 70 keV. To identify the source of the x-rays within the neutron generator assembly, it was scanned by collimated scintillation detectors along its long axis. At the strongest x-ray emission points, the generator also was rotated 60° between measurements. The scans show the primary source of x-ray emission from the P385 neutron generator is an area 60 mm from the neutron production target, in the vicinity of the ion source. Rotation of the neutron generator did not significantly alter the x-ray count rate, and the x-ray emission appears to be axially symmetric within the neutron generator.« less

Parametric studies and characterization measurements of x-ray lithography mask membranes

NASA Astrophysics Data System (ADS)

Wells, Gregory M.; Chen, Hector T. H.; Engelstad, Roxann L.; Palmer, Shane R.

1991-08-01

The techniques used in the experimental characterization of thin membranes are considered for their potential use as mask blanks for x-ray lithography. Among the parameters of interest for this evaluation are the film's stress, fracture strength, uniformity of thickness, absorption in the x-ray and visible spectral regions and the modulus and grain structure of the material. The experimental techniques used for measuring these properties are described. The accuracy and applicability of the assumptions used to derive the formulas that relate the experimental measurements to the parameters of interest are considered. Experimental results for silicon carbide and diamond films are provided. Another characteristic needed for an x-ray mask carrier is radiation stability. The number of x-ray exposures expected to be performed in the lifetime of an x-ray mask on a production line is on the order of 107. The dimensional stability requirements placed on the membranes during this period are discussed. Interferometric techniques that provide sufficient sensitivity for these stability measurements are described. A comparison is made between the different techniques that have been developed in term of the information that each technique provides, the accuracy of the various techniques, and the implementation issues that are involved with each technique.

The Ferrara hard X-ray facility for testing/calibrating hard X-ray focusing telescopes

NASA Astrophysics Data System (ADS)

Loffredo, Gianluca; Frontera, Filippo; Pellicciotta, Damiano; Pisa, Alessandro; Carassiti, Vito; Chiozzi, Stefano; Evangelisti, Federico; Landi, Luca; Melchiorri, Michele; Squerzanti, Stefano

2005-12-01

We will report on the current configuration of the X-ray facility of the University of Ferrara recently used to perform reflectivity tests of mosaic crystals and to calibrate the experiment JEM X aboard Integral. The facility is now located in the technological campus of the University of Ferrara in a new building (named LARIX laboratory= LARge Italian X-ray facility) that includes a tunnel 100 m long with, on the sides, two large experimental rooms. The facility is being improved for determining the optical axis of mosaic crystals in Laue configuration, for calibrating Laue lenses and hard X-ray mirror prototypes.

Soft x-ray transmission grating spectrometer for X-ray Surveyor and smaller missions with high resolving power

NASA Astrophysics Data System (ADS)

Heilmann, Ralf K.; Bruccoleri, Alexander; Schattenburg, Mark; Kolodziejczak, jeffery; Gaskin, Jessica; O'Dell, Stephen L.

2017-01-01

A number of high priority subjects in astrophysics are addressed by a state-of-the-art soft x-ray grating spectrometer, e.g. the role of Active Galactic Nuclei in galaxy and star formation, characterization of the WHIM and the “missing baryon” problem, characterization of halos around the Milky Way and nearby galaxies, and stellar coronae and surrounding winds and disks. An Explorer-scale, large-area (A > 1,000 cm2), high resolving power (R > 3,000) soft x-ray grating spectrometer is highly feasible based on Critical-Angle Transmission (CAT) grating technology, even for telescopes with angular resolution of 5-10 arcsec. Significantly higher performance could be provided by a CAT grating spectrometer on an X-ray-Surveyor-type mission (A > 4,000 cm2, R > 5,000). CAT gratings combine advantages of blazed reflection gratings (high efficiency, use of higher orders) with those of transmission gratings (low mass, relaxed alignment tolerances and temperature requirements, transparent at higher energies) with minimal mission resource requirements. Blazing is achieved through grazing-incidence reflection off the smooth silicon grating bar sidewalls. Silicon is well matched to the soft x-ray band, and 30% absolute diffraction efficiency has been acheived with clear paths for further improvement. CAT gratings with sidewalls made of high-Z elements allow extension of blazing to higher energies and larger dispersion angles, enabling higher resolving power at shorter wavelengths. X-ray data from CAT gratings coated with a thin layer of platinum using atomic layer deposition demonstrate efficient blazing to higher energies and much larger blaze angles than possible with silicon alone. Measurements of the resolving power of a breadboard CAT grating spectrometer consisting of a Wolter-I slumped-glass focusing optic from GSFC and CAT gratings, taken at the MSFC Stray Light Facility, have demonstrated resolving power > 10,000. Thus currently fabricated CAT gratings are compatible

X-ray based displacement and strain measurements for hostile environments

NASA Technical Reports Server (NTRS)

Canistraro, Howard A.; Jordan, Eric H.; Pease, Douglas M.

1993-01-01

A completely new method of non-contacting, hostile environment displacement and strain measurement based on the focus and scanning of x-rays, has been developed and demonstrated. The new technique has the ability to overcome many of the limitations associated with available methods. The system is based on the focus and scanning of low energy, hard x-rays such as those emanating from table top copper or molybdenum sources. The x-rays are focused into a narrow and intense line image which can be swept onto targets that fluoresce secondary x-ray radiation. By monitoring the secondary radiation intensity and comparing it with the focused x-ray image's position as it is swept over the target edge, the position of the target edge relative to the focused image can be determined. The present system has a resolution of 0.5 micron, which has been shown to be limited by bearing backlash (or 'yaw' error) in the linear translation table. Its use has been demonstrated in the presence of an open flame with a resultant target temperature in excess of 2000 degrees Fahrenheit (1000 degrees Celsius). Strain measurements have been conducted in a laboratory environment at both room temperature and at a specimen temperature of 1300 degrees Fahrenheit, with an accuracy of within 20 microstrain (primarily a function of the 0.5 micron resolution limit). The main advantage of the technique lies in the penetrating, non-refractive nature of x-rays, which are virtually immune to the presence of refracting gas layers, smoke, flame or intense thermal radiation.

Quantitative X-ray Differential Interference Contrast Microscopy

NASA Astrophysics Data System (ADS)

Nakamura, Takashi

Full-field soft x-ray microscopes are widely used in many fields of sciences. Advances in nanofabrication technology enabled short wavelength focusing elements with significantly improved spatial resolution. In the soft x-ray spectral region, samples as small as 12 nm can be resolved using micro zone-plates as the objective lens. In addition to conventional x-ray microscopy in which x-ray absorption difference provides the image contrast, phase contrast mechanisms such as differential phase contrast (DIC) and Zernike phase contrast have also been demonstrated These phase contrast imaging mechanisms are especially attractive at the x-ray wavelengths where phase contrast of most materials is typically 10 times stronger than the absorption contrast. With recent progresses in plasma-based x- ray sources and increasing accessibility to synchrotron user facilities, x-ray microscopes are quickly becoming standard measurement equipment in the laboratory. To further the usefulness of x-ray DIC microscopy this thesis explicitly addresses three known issues with this imaging modality by introducing new techniques and devices First, as opposed to its visible-light counterpart, no quantitative phase imaging technique exists for x-ray DIC microscopy. To address this issue, two nanoscale x-ray quantitative phase imaging techniques, using exclusive OR (XOR) patterns and zone-plate doublets, respectively, are proposed. Unlike existing x-ray quantitative phase imaging techniques such as Talbot interferometry and ptychography, no dedicated experimental setups or stringent illumination coherence are needed for quantitative phase retrieval. Second, to the best of our knowledge, no quantitative performance characterization of DIC microscopy exists to date. Therefore the imaging system's response to sample's spatial frequency is not known In order to gain in-depth understanding of this imaging modality, performance of x-ray DIC microscopy is quantified using modulation transfer function

Normal incidence x-ray mirror for chemical microanalysis

DOEpatents

Carr, M.J.; Romig, A.D. Jr.

1987-08-05

An x-ray mirror for both electron column instruments and micro x-ray fluorescence instruments for making chemical, microanalysis comprises a non-planar mirror having, for example, a spherical reflecting surface for x-rays comprised of a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on a substrate and whose layers have a thickness which is a multiple of the wavelength being reflected. For electron column instruments, the wavelengths of interest lie above 1.5nm, while for x-ray fluorescence instruments, the range of interest is below 0.2nm. 4 figs.

Design of a normal incidence multilayer imaging X-ray microscope

NASA Astrophysics Data System (ADS)

Shealy, David L.; Gabardi, David R.; Hoover, Richard B.; Walker, Arthur B. C., Jr.; Lindblom, Joakim F.

Normal incidence multilayer Cassegrain X-ray telescopes were flown on the Stanford/MSFC Rocket X-ray Spectroheliograph. These instruments produced high spatial resolution images of the sun and conclusively demonstrated that doubly reflecting multilayer X-ray optical systems are feasible. The images indicated that aplanatic imaging soft X-ray/EUV microscopes should be achievable using multilayer optics technology. A doubly reflecting normal incidence multilayer imaging X-ray microscope based on the Schwarzschild configuration has been designed. The design of the microscope and the results of the optical system ray trace analysis are discussed. High resolution aplanatic imaging X-ray microscopes using normal incidence multilayer X-ray mirrors should have many important applications in advanced X-ray astronomical instrumentation, X-ray lithography, biological, biomedical, metallurgical, and laser fusion research.

X-ray magnetic circular dichroism measured at the Fe K-edge with a reduced intrinsic broadening: x-ray absorption spectroscopy versus resonant inelastic x-ray scattering measurements

NASA Astrophysics Data System (ADS)

Juhin, Amélie; Sainctavit, Philippe; Ollefs, Katharina; Sikora, Marcin; Filipponi, Adriano; Glatzel, Pieter; Wilhelm, Fabrice; Rogalev, Andrei

2016-12-01

X-ray magnetic circular dichroism is measured at the Fe K pre-edge in yttrium iron garnet using two different procedures that allow reducing the intrinsic broadening due to the 1s corehole lifetime. First, deconvolution of XMCD data measured in total fluorescence yield (TFY) with an extremely high signal-to-noise ratio enables a factor of 2.4 to be gained in the XMCD intensity. Ligand field multiplet calculations performed with different values of intrinsic broadening show that deconvolving such high quality XMCD data is similar to reducing the lifetime broadening from a 1s corehole to a 2p corehole. Second, MCD is measured by resonant inelastic x-ray scattering spectroscopy as a function of incident energy and emission energy. Selection of a fixed emission energy, instead of using the TFY, allows enhancing the MCD intensity up to a factor of  ˜4.7. However, this significantly changes the spectral shape of the XMCD signal, which cannot be interpreted any more as an absorption spectrum.

A high-density relativistic reflection origin for the soft and hard X-ray excess emission from Mrk 1044

NASA Astrophysics Data System (ADS)

Mallick, L.; Alston, W. N.; Parker, M. L.; Fabian, A. C.; Pinto, C.; Dewangan, G. C.; Markowitz, A.; Gandhi, P.; Kembhavi, A. K.; Misra, R.

2018-06-01

We present the first results from a detailed spectral-timing analysis of a long (˜130 ks) XMM-Newton observation and quasi-simultaneous NuSTAR and Swift observations of the highly-accreting narrow-line Seyfert 1 galaxy Mrk 1044. The broadband (0.3-50 keV) spectrum reveals the presence of a strong soft X-ray excess emission below ˜1.5 keV, iron Kα emission complex at ˜6 -7 keV and a `Compton hump' at ˜15 -30 keV. We find that the relativistic reflection from a high-density accretion disc with a broken power-law emissivity profile can simultaneously explain the soft X-ray excess, highly ionized broad iron line and the Compton hump. At low frequencies ([2 - 6] × 10-5 Hz), the power-law continuum dominated 1.5-5 keV band lags behind the reflection dominated 0.3-1 keV band, which is explained with a combination of propagation fluctuation and Comptonization processes, while at higher frequencies ([1 - 2] × 10-4 Hz), we detect a soft lag which is interpreted as a signature of X-ray reverberation from the accretion disc. The fractional root-mean-squared (rms) variability of the source decreases with energy and is well described by two variable components: a less variable relativistic disc reflection and a more variable direct coronal emission. Our combined spectral-timing analyses suggest that the observed broadband X-ray variability of Mrk 1044 is mainly driven by variations in the location or geometry of the optically thin, hot corona.

X-ray Thomson scattering measurement of temperature in warm dense carbon

DOE PAGES

Falk, Katerina; Fryer, C. L.; Gamboa, E. J.; ...

2016-11-22

Here, a novel platform to measure the equation of state using a combination of diagnostics, where the spectrally resolved x-ray Thomson scattering (XRTS) is used to obtain accurate temperature measurements of warm dense matter (WDM) was developed for the OMEGA laser facility. OMEGA laser beams have been used to drive strong shocks in carbon targets creating WDM and generating the Ni He-alpha x-ray probe used for XRTS. Additional diagnostics including x-ray radiography, velocity interferometry and streaked optical pyrometry provided complementary measurements of density and pressure. The WDM regime of near solid density and moderate temperatures (1–100 eV) is a challengingmore » yet important area of research in inertial confinement fusion and astrophysics. This platform has been used to study off-Hugoniot states of shock-released diamond and graphite at pressures between 1 and 10 Mbar and temperatures between 5 and 15 eV as well as first x-ray Thomson scattering data from shocked low density CH foams reaching five times compression and temperatures of 20–30 eV.« less

Total x-ray power measurements in the Sandia LIGA program.

DOE Office of Scientific and Technical Information (OSTI.GOV)

Malinowski, Michael E.; Ting, Aili

2005-08-01

Total X-ray power measurements using aluminum block calorimetry and other techniques were made at LIGA X-ray scanner synchrotron beamlines located at both the Advanced Light Source (ALS) and the Advanced Photon Source (APS). This block calorimetry work was initially performed on the LIGA beamline 3.3.1 of the ALS to provide experimental checks of predictions of the LEX-D (LIGA Exposure- Development) code for LIGA X-ray exposures, version 7.56, the version of the code in use at the time calorimetry was done. These experiments showed that it was necessary to use bend magnet field strengths and electron storage ring energies different frommore » the default values originally in the code in order to obtain good agreement between experiment and theory. The results indicated that agreement between LEX-D predictions and experiment could be as good as 5% only if (1) more accurate values of the ring energies, (2) local values of the magnet field at the beamline source point, and (3) the NIST database for X-ray/materials interactions were used as code inputs. These local magnetic field value and accurate ring energies, together with NIST database, are now defaults in the newest release of LEX-D, version 7.61. Three dimensional simulations of the temperature distributions in the aluminum calorimeter block for a typical ALS power measurement were made with the ABAQUS code and found to be in good agreement with the experimental temperature data. As an application of the block calorimetry technique, the X-ray power exiting the mirror in place at a LIGA scanner located at the APS beamline 10 BM was measured with a calorimeter similar to the one used at the ALS. The overall results at the APS demonstrated the utility of calorimetry in helping to characterize the total X-ray power in LIGA beamlines. In addition to the block calorimetry work at the ALS and APS, a preliminary comparison of the use of heat flux sensors, photodiodes and modified beam calorimeters as total X-ray power

NUSTAR and Suzaku x-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

DOE Office of Scientific and Technical Information (OSTI.GOV)

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spinmore » $$a\\gt 0.9$$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. We discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.« less

Telescope for x ray and gamma ray studies in astrophysics

NASA Technical Reports Server (NTRS)

Weaver, W. D.; Desai, Upendra D.

1993-01-01

Imaging of x-rays has been achieved by various methods in astrophysics, nuclear physics, medicine, and material science. A new method for imaging x-ray and gamma-ray sources avoids the limitations of previously used imaging devices. Images are formed in optical wavelengths by using mirrors or lenses to reflect and refract the incoming photons. High energy x-ray and gamma-ray photons cannot be reflected except at grazing angles and pass through lenses without being refracted. Therefore, different methods must be used to image x-ray and gamma-ray sources. Techniques using total absorption, or shadow casting, can provide images in x-rays and gamma-rays. This new method uses a coder made of a pair of Fresnel zone plates and a detector consisting of a matrix of CsI scintillators and photodiodes. The Fresnel zone plates produce Moire patterns when illuminated by an off-axis source. These Moire patterns are deconvolved using a stepped sine wave fitting or an inverse Fourier transform. This type of coder provides the capability of an instantaneous image with sub-arcminute resolution while using a detector with only a coarse position-sensitivity. A matrix of the CsI/photodiode detector elements provides the necessary coarse position-sensitivity. The CsI/photodiode detector also allows good energy resolution. This imaging system provides advantages over previously used imaging devices in both performance and efficiency.

X-ray power and yield measurements at the refurbished Z machine

DOE PAGES

Jones, M. C.; Ampleford, D. J.; Cuneo, M. E.; ...

2014-08-04

Advancements have been made in the diagnostic techniques to measure accurately the total radiated x-ray yield and power from z-pinch loads at the Z Machine with high accuracy. The Z-accelerator is capable of outputting 2MJ and 330 TW of x-ray yield and power, and accurately measuring these quantities is imperative. We will describe work over the past several years which include the development of new diagnostics, improvements to existing diagnostics, and implementation of automated data analysis routines. A set of experiments were conducted on the Z machine where the load and machine configuration were held constant. During this shot series,more » it was observed that total z-pinch x-ray emission power determined from the two common techniques for inferring the x-ray power, Kimfol filtered x-ray diode diagnostic and the Total Power and Energy diagnostic gave 450 TW and 327 TW respectively. Our analysis shows the latter to be the more accurate interpretation. More broadly, the comparison demonstrates the necessity to consider spectral response and field of view when inferring xray powers from z-pinch sources.« less

Measurement of the vacuum-ultraviolet absorption spectrum of low-k dielectrics using X-ray reflectivity

NASA Astrophysics Data System (ADS)

Choudhury, F. A.; Nguyen, H. M.; King, S. W.; Lee, C. H.; Lin, Y. H.; Fung, H. S.; Chen, C. C.; Li, W.; Benjamin, D.; Blatz, J. M.; Nishi, Y.; Shohet, J. L.

2018-02-01

During plasma processing, low-k dielectrics are exposed to high levels of vacuum ultraviolet (VUV) radiation that can cause severe damage to dielectric materials. The degree and nature of VUV-induced damage depend on the VUV photon energies and fluence. In this work, we examine the VUV-absorption spectrum of low-k organosilicate glass using specular X-ray reflectivity (XRR). Low-k SiCOH films were exposed to synchrotron VUV radiation with energies ranging from 7 to 21 eV, and the density vs. depth profile of the VUV-irradiated films was extracted from fitting the XRR experimental data. The results show that the depth of the VUV-induced damage layer is a function of the photon energy. Between 7 and 11 eV, the depth of the damaged layer decreases sharply from 110 nm to 60 nm and then gradually increases to 85 nm at 21 eV. The maximum VUV absorption in low-k films occurs between 11 and 15 eV. The depth of the damaged layer was found to increase with film porosity.

Total reflection X-ray fluorescence analysis of airborne silver nanoparticles from fabrics.

PubMed

Menzel, Magnus; Fittschen, Ursula Elisabeth Adriane

2014-03-18

Ag nanoparticles (NPs) are usually applied to consumer products because of their antimicrobial properties, which are desired in fabrics for sportswear as well as cloth used for cleaning. Hazards to human health from airborne Ag NPs may occur when the NPs are inhaled. NPs are comparable in size to macromolecules and viruses and able to penetrate deep into the lungs, e.g., the alveoli, where they may cause damage to cells and tissue due to their large surface area. In this study, aerosols released form fabrics treated with Ag NPs were collected using a low pressure Berner impactor and analyzed with total reflection X-ray fluorescence (TXRF). We found that the Ag NPs are released primarily in the form of larger particles, mainly 0.13-2 μm, probably attached to fiber material. Using an electron micro probe, single particles could be identified. The detection of backscattered electrons suggests small spots on the particle consist of a heavier element, which most likely is Ag, although the signal in energy-dispersive X-ray spectroscopy (EDX) was below the lower limit of detection (LOD). To achieve LODs necessary for Ag determination, Ar peaks were eliminated by a nitrogen atmosphere provided by the "Picofox-box". This enables linear calibration and quantification of Ag. The LOD was calculated at 0.2 ng (2.0 ppb). Following the TXRF and scanning electron microscopy (SEM)/EDX analysis, the aerosol samples were dissolved in nitric acid and analyzed with ICPMS to successfully confirm the results obtained by the TXRF measurements.

X-ray lithography using holographic images

DOEpatents

Howells, Malcolm R.; Jacobsen, Chris

1995-01-01

A non-contact X-ray projection lithography method for producing a desired X-ray image on a selected surface of an X-ray-sensitive material, such as photoresist material on a wafer, the desired X-ray image having image minimum linewidths as small as 0.063 .mu.m, or even smaller. A hologram and its position are determined that will produce the desired image on the selected surface when the hologram is irradiated with X-rays from a suitably monochromatic X-ray source of a selected wavelength .lambda.. On-axis X-ray transmission through, or off-axis X-ray reflection from, a hologram may be used here, with very different requirements for monochromaticity, flux and brightness of the X-ray source. For reasonable penetration of photoresist materials by X-rays produced by the X-ray source, the wavelength X, is preferably chosen to be no more than 13.5 nm in one embodiment and more preferably is chosen in the range 1-5 nm in the other embodiment. A lower limit on linewidth is set by the linewidth of available microstructure writing devices, such as an electron beam.

Densitometry and temperature measurement of combustion gas by X-ray Compton scattering

PubMed Central

Sakurai, Hiroshi; Kawahara, Nobuyuki; Itou, Masayoshi; Tomita, Eiji; Suzuki, Kosuke; Sakurai, Yoshiharu

2016-01-01

Measurement of combustion gas by high-energy X-ray Compton scattering is reported. The intensity of Compton-scattered X-rays has shown a position dependence across the flame of the combustion gas, allowing us to estimate the temperature distribution of the combustion flame. The energy spectra of Compton-scattered X-rays have revealed a significant difference across the combustion reaction zone, which enables us to detect the combustion reaction. These results demonstrate that high-energy X-ray Compton scattering can be employed as an in situ technique to probe inside a combustion reaction. PMID:26917151

Densitometry and temperature measurement of combustion gas by X-ray Compton scattering.

PubMed

Sakurai, Hiroshi; Kawahara, Nobuyuki; Itou, Masayoshi; Tomita, Eiji; Suzuki, Kosuke; Sakurai, Yoshiharu

2016-03-01

Measurement of combustion gas by high-energy X-ray Compton scattering is reported. The intensity of Compton-scattered X-rays has shown a position dependence across the flame of the combustion gas, allowing us to estimate the temperature distribution of the combustion flame. The energy spectra of Compton-scattered X-rays have revealed a significant difference across the combustion reaction zone, which enables us to detect the combustion reaction. These results demonstrate that high-energy X-ray Compton scattering can be employed as an in situ technique to probe inside a combustion reaction.

The X-Ray Reflection Spectrum of the Radio-Loud Quasar 4C 74.26

NASA Technical Reports Server (NTRS)

Lohfink, Ann M.; Fabian, Andrew C.; Ballantyne, David R.; Boggs, S. E.; Boorman, Peter; Christensen, F. E.; Craig, W. W.; Farrah, Duncan; Garcia, Javier; Hailey, C. J.;

The X-Ray Reflection Spectrum of the Radio-loud Quasar 4C 74.26

NASA Astrophysics Data System (ADS)

Lohfink, Anne M.; Fabian, Andrew C.; Ballantyne, David R.; Boggs, S. E.; Boorman, Peter; Christensen, F. E.; Craig, W. W.; Farrah, Duncan; García, Javier; Hailey, C. J.; Harrison, F. A.; Ricci, Claudio; Stern, Daniel; Zhang, W. W.

2017-06-01

The relativistic jets created by some active galactic nuclei are important agents of AGN feedback. In spite of this, our understanding of what produces these jets is still incomplete. X-ray observations, which can probe the processes operating in the central regions in the immediate vicinity of the supermassive black hole, the presumed jet launching point, are potentially particularly valuable in illuminating the jet formation process. Here, we present the hard X-ray NuSTAR observations of the radio-loud quasar 4C 74.26 in a joint analysis with quasi-simultaneous, soft X-ray Swift observations. Our spectral analysis reveals a high-energy cutoff of {183}-35+51 keV and confirms the presence of ionized reflection in the source. From the average spectrum we detect that the accretion disk is mildly recessed, with an inner radius of R in = 4-180 R g. However, no significant evolution of the inner radius is seen during the three months covered by our NuSTAR campaign. This lack of variation could mean that the jet formation in this radio-loud quasar differs from what is observed in broad-line radio galaxies.

Large-area soft x-ray projection lithography using multilayer mirrors structured by RIE

NASA Astrophysics Data System (ADS)

Rahn, Steffen; Kloidt, Andreas; Kleineberg, Ulf; Schmiedeskamp, Bernt; Kadel, Klaus; Schomburg, Werner K.; Hormes, F. J.; Heinzmann, Ulrich

1993-01-01

SXPL (soft X-ray projection lithography) is one of the most promising applications of X-ray reflecting optics using multilayer mirrors. Within our collaboration, such multilayer mirrors were fabricated, characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors were produced by electron beam evaporation in UHV under thermal treatment with an in-situ X-ray controlled thickness in the region of 2d equals 14 nm. The reflectivities measured at normal incidence reached up to 54%. Various surface analysis techniques have been applied in order to characterize and optimize the X-ray mirrors. The multilayers were patterned by reactive ion etching (RIE) with CF(subscript 4), using a photoresist as the etch mask, thus producing X-ray reflection masks. The masks were tested in the synchrotron radiation laboratory of the electron accelerator ELSA at the Physikalisches Institut of Bonn University. A double crystal X-ray monochromator was modified so as to allow about 0.5 cm(superscript 2) of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto the resist (Hoechst AZ PF 514), which was mounted at an average distance of about 7 mm. In the first test-experiments, structure sizes down to 8 micrometers were nicely reproduced over the whole of the exposed area. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

Methods for coherent lensless imaging and X-ray wavefront measurements

NASA Astrophysics Data System (ADS)

Guizar Sicairos, Manuel

X-ray diffractive imaging is set apart from other high-resolution imaging techniques (e.g. scanning electron or atomic force microscopy) for its high penetration depth, which enables tomographic 3D imaging of thick samples and buried structures. Furthermore, using short x-ray pulses, it enables the capability to take ultrafast snapshots, giving a unique opportunity to probe nanoscale dynamics at femtosecond time scales. In this thesis we present improvements to phase retrieval algorithms, assess their performance through numerical simulations, and develop new methods for both imaging and wavefront measurement. Building on the original work by Faulkner and Rodenburg, we developed an improved reconstruction algorithm for phase retrieval with transverse translations of the object relative to the illumination beam. Based on gradient-based nonlinear optimization, this algorithm is capable of estimating the object, and at the same time refining the initial knowledge of the incident illumination and the object translations. The advantages of this algorithm over the original iterative transform approach are shown through numerical simulations. Phase retrieval has already shown substantial success in wavefront sensing at optical wavelengths. Although in principle the algorithms can be used at any wavelength, in practice the focus-diversity mechanism that makes optical phase retrieval robust is not practical to implement for x-rays. In this thesis we also describe the novel application of phase retrieval with transverse translations to the problem of x-ray wavefront sensing. This approach allows the characterization of the complex-valued x-ray field in-situ and at-wavelength and has several practical and algorithmic advantages over conventional focused beam measurement techniques. A few of these advantages include improved robustness through diverse measurements, reconstruction from far-field intensity measurements only, and significant relaxation of experimental

X-rays and gamma-rays from accretion flows onto black holes in Seyferts and X-ray binaries

NASA Technical Reports Server (NTRS)

Zdziarski, Andrzej A.; Johnson, W. Neil; Poutanen, Juri; Magdziarz, Pawel; Gierlinski, Marek

1997-01-01

Observations and theoretical models of X-ray/gamma ray spectra of radio quiet Seyfert galaxies and Galactic black hole candidates are reviewed. The spectra from these objects share the following characteristics: an underlying power law with a high energy cutoff above 200 keV; a Compton reflection component with a Fe K alpha line, and a low energy absorption by intervening cold matter. The X-ray energy spectral index, alpha, is typically in the range between 0.8 and 1 in Seyfert spectra, and that of the hard state spectra of the black hole candidates Cygnus X-1 and GX 339-4 is typically between 0.6 and 0.8. The Compton reflection component corresponds with cold matter covering a solid angle of between 0.8pi and 2pi as seen from the X-ray source. The broadband spectra of both classes of sources are well fitted by Compton upscattering of soft photons in thermal plasma. The fits yield a thermal plasma temperature of 100 keV and the Thomson optical depth of 1. All the spectra presented are cut off before the electron rest energy 511 keV, indicating that electron/positron pair production is an important process.

X-ray Measurements of Laser Irradiated Foam Filled Liners

NASA Astrophysics Data System (ADS)

Patankar, Siddharth; Mariscal, Derek; Goyon, Clement; Baker, Kevin; MacLaren, Stephan; Hammer, Jim; Baumann, Ted; Amendt, Peter; Menapace, Joseph; Berger, Bob; Afeyan, Bedros; Tabak, Max; Dixit, Sham; Kim, Sung Ho; Moody, John; Jones, Ogden

2016-10-01

Low-density foam liners are being investigated as sources of efficient x-rays. Understanding the laser-foam interaction is key to modeling and optimizing foam composition and density for x-ray production with reduced backscatter. We report on the experimental results of laser-irradiated foam liners filled with SiO2 and Ta2O5 foams at densities between 2 to 30mg/cc. The foam liners consist of polyimide tubes filled with low-density foams and sealed with a gold foil at one end. The open end of the tube is driven with 250J of 527nm laser light in a 2ns 2-step pulse using the Jupiter Laser Facility at LLNL. A full aperture backscatter system is used to diagnose the coupled energy and losses. A streaked x-ray camera and filtered x-ray pinhole cameras are used to measure laser penetration into the low-density foam for different mass densities. A HOPG crystal spectrometer is used to estimate a thermal electron temperature. Comparisons with beam propagation and x-ray emission simulations are presented. This work was performed under the auspices of the U.S. Department of Energy by the Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344, with funding support from the Laboratory Directed Research and Development Program under project 15.

X-ray Thomson scattering measurements from hohlraum-driven spheres on the OMEGA laser [X-ray Thomson scattering measurements from hohlraum targets on the OMEGA laser

DOE PAGES

Saunders, A. M.; Jenei, A.; Doppner, T.; ...

2016-08-30

X-ray Thomson scattering (XRTS) is a powerful diagnostic for probing warm and hot dense matter. We present the design and results of the first XRTS experiments with hohlraum-driven CH 2 targets on the OMEGA laser. X-rays seen directly from the XRTS x-ray source overshadow the elastic scattering signal from the target capsule, but can be controlled in future experiments. From the inelastic scattering signal, an average plasma temperature is inferred that is in reasonable agreement with the temperatures predicted by simulations. Here, knowledge gained in this experiment show a promising future for further XRTS measurements on indirectly driven OMEGA targets.

X-ray Thomson scattering measurements from hohlraum-driven spheres on the OMEGA laser [X-ray Thomson scattering measurements from hohlraum targets on the OMEGA laser

DOE Office of Scientific and Technical Information (OSTI.GOV)

Saunders, A. M.; Jenei, A.; Doppner, T.

X-ray Thomson scattering (XRTS) is a powerful diagnostic for probing warm and hot dense matter. We present the design and results of the first XRTS experiments with hohlraum-driven CH 2 targets on the OMEGA laser. X-rays seen directly from the XRTS x-ray source overshadow the elastic scattering signal from the target capsule, but can be controlled in future experiments. From the inelastic scattering signal, an average plasma temperature is inferred that is in reasonable agreement with the temperatures predicted by simulations. Here, knowledge gained in this experiment show a promising future for further XRTS measurements on indirectly driven OMEGA targets.

X-ray diffraction from flight muscle with a headless myosin mutation: implications for interpreting reflection patterns

PubMed Central

Iwamoto, Hiroyuki; Trombitás, Károly; Yagi, Naoto; Suggs, Jennifer A.; Bernstein, Sanford I.

2014-01-01

Fruit fly (Drosophila melanogaster) is one of the most useful animal models to study the causes and effects of hereditary diseases because of its rich genetic resources. It is especially suitable for studying myopathies caused by myosin mutations, because specific mutations can be induced to the flight muscle-specific myosin isoform, while leaving other isoforms intact. Here we describe an X-ray-diffraction-based method to evaluate the structural effects of mutations in contractile proteins in Drosophila indirect flight muscle. Specifically, we describe the effect of the headless myosin mutation, Mhc10-Y97, in which the motor domain of the myosin head is deleted, on the X-ray diffraction pattern. The loss of general integrity of the filament lattice is evident from the pattern. A striking observation, however, is the prominent meridional reflection at d = 14.5 nm, a hallmark for the regularity of the myosin-containing thick filament. This reflection has long been considered to arise mainly from the myosin head, but taking the 6th actin layer line reflection as an internal control, the 14.5-nm reflection is even stronger than that of wild-type muscle. We confirmed these results via electron microscopy, wherein image analysis revealed structures with a similar periodicity. These observations have major implications on the interpretation of myosin-based reflections. PMID:25400584

SARS E protein in phospholipid bilayers: an anomalous X-ray reflectivity study

NASA Astrophysics Data System (ADS)

Khattari, Z.; Brotons, G.; Arbely, E.; Arkin, I. T.; Metzger, T. H.; Salditt, T.

2005-02-01

We report on an anomalous X-ray reflectivity study to locate a labelled residue of a membrane protein with respect to the lipid bilayer. From such experiments, important constraints on the protein or peptide conformation can be derived. Specifically, our aim is to localize an iodine-labelled phenylalanine in the SARS E protein, incorporated in DMPC phospholipid bilayers, which are deposited in the form of thick multilamellar stacks on silicon surfaces. Here, we discuss the experimental aspects and the difficulties associated with the Fourier synthesis analysis that gives the electron density profile of the membranes.

Generation and dose distribution measurement of flash x-ray in KALI-5000 system

DOE Office of Scientific and Technical Information (OSTI.GOV)

Menon, Rakhee; Roy, Amitava; Mitra, S.

2008-10-15

Flash x-ray generation studies have been carried out in KALI-5000 Pulse power system. The intense relativistic electron beam has been bombarded on a tantalum target at anode to produce flash x-ray via bremsstrahlung conversion. The typical electron beam parameter was 360 kV, 18 kA, and 100 ns, with a few hundreds of A/cm{sup 2} current density. The x-ray dose has been measured with calcium sulfate:dysposium (CaSO{sub 4}:Dy) thermoluminescent dosimeter and the axial dose distribution has been characterized. It has been observed that the on axis dose falls of with distance {approx}1/x{sup n}, where n varies from 1.8 to 1.85. Amore » maximum on axis dose of 46 mrad has been measured at 1 m distance from the source. A plastic scintillator with optical fiber coupled to a photomultiplier tube has been developed to measure the x-ray pulse width. The typical x-ray pulse width varied from 50 to 80 ns.« less

Compton Reflection in AGN with Simbol-X

NASA Astrophysics Data System (ADS)

Beckmann, V.; Courvoisier, T. J.-L.; Gehrels, N.; Lubiński, P.; Malzac, J.; Petrucci, P. O.; Shrader, C. R.; Soldi, S.

2009-05-01

AGN exhibit complex hard X-ray spectra. Our current understanding is that the emission is dominated by inverse Compton processes which take place in the corona above the accretion disk, and that absorption and reflection in a distant absorber play a major role. These processes can be directly observed through the shape of the continuum, the Compton reflection hump around 30 keV, and the iron fluorescence line at 6.4 keV. We demonstrate the capabilities of Simbol-X to constrain complex models for cases like MCG-05-23-016, NGC 4151, NGC 2110, and NGC 4051 in short (10 ksec) observations. We compare the simulations with recent observations on these sources by INTEGRAL, Swift and Suzaku. Constraining reflection models for AGN with Simbol-X will help us to get a clear view of the processes and geometry near to the central engine in AGN, and will give insight to which sources are responsible for the Cosmic X-ray background at energies >20 keV.

High Performance Non-Dispersive X-Ray Spectrometers for Charge Exchange Measurements

NASA Technical Reports Server (NTRS)

Porter Frederick; Adams, J.; Beiersdorfer, P.; Brown, G. V.; Karkatoua, D.; Kelley, R. L.; Kilbourne, C. A.; Lautenagger, M.

2010-01-01

Currently, the only measurements of cosmological charge exchange have been made using low resolution, non-dispersive spectrometers like the PSPC on ROSAT and the CCD instruments on Chandra and XMM/Newton. However, upcoming cryogenic spectrometers on Astro-H and IXO will add vast new capabilities to investigate charge exchange in local objects such as comets and planetary atmospheres. They may also allow us to observe charge exchange in extra-solar objects such as galactic supernova remnants. With low spectral resolution instruments such as CCDs, x-ray emission due to charge exchange recombination really only provides information on the acceptor species, such as the solar wind. With the new breed of x-ray calorimeter instruments, emission from charge exchange becomes highly diagnostic allowing one to uniquely determine the acceptor species, ionization state, donor species and ionization state, and the relative velocity of the interaction. We will describe x-ray calorimeter instrumentation and its potential for charge exchange measurements in the near term. We will also touch on the instrumentation behind a decade of high resolution measurements of charge exchange using an x-ray calorimeter at the Lawrence Livermore National Laboratory.

X-ray off-specular reflectivity studies of electrochemical pitting of Cu surfaces in sodium bicarbonate solution

NASA Astrophysics Data System (ADS)

Feng, Y. P.; Sinha, S. K.; Melendres, C. A.; Lee, D. D.

1996-02-01

We have studied the electrochemically-induced pitting process on a Cu electrode in NaHCO 3 solution using in-situ X-ray off-specular reflectivity measurements. The morphology and growth dynamics of the localized corrosion sites or pits were studied as the applied potential was varied from the cathodic region where the Cu surface is relatively free of oxide films to the anodic region where surface roughening occurs by general corrosion with concomitant formation of an oxide film. Quantitative analysis of the experimental results indicates that early pitting proceeds in favor of nucleation of pit clusters over individual pit growth. It was found that the lateral distribution of the pits is not random but exhibits a short-range order as evidenced by the appearance of a side peak in the transverse off-specular reflectivity. The position, height, and width of the peak was modeled to yield the average size, nearest-neighbor distance (within any one of the clusters), and over-all density of the pits averaged over the entire illuminated surface. In addition, measurements of the longitudinal off-specular reflectivity indicate a bimodal depth distribution for the pits, suggesting a “film breaking” type of pitting mechanism.

LCLS in—photon out: fluorescence measurement of neon using soft x-rays

DOE PAGES

Obaid, Razib; Buth, Christian; Dakovski, Georgi L.; ...

2018-01-09

Here, we measured the fluorescence photon yield of neon upon soft x-ray ionization (~1200 eV) from the x-ray free-electron laser at Linac Coherent Light Source, and demonstrated the usage of a grazing incidence spectrometer with a variable line spacing grating to perform x-ray fluorescence spectroscopy on a gas phase system. Our measurements also allowed us to estimate the focal size of the beam from the theoretical description developed, in terms of the rate equation approximation accounting for photoionization shake off of neutral neon and double auger decay of single core holes.

LCLS in—photon out: fluorescence measurement of neon using soft x-rays

NASA Astrophysics Data System (ADS)

Obaid, Razib; Buth, Christian; Dakovski, Georgi L.; Beerwerth, Randolf; Holmes, Michael; Aldrich, Jeff; Lin, Ming-Fu; Minitti, Michael; Osipov, Timur; Schlotter, William; Cederbaum, Lorenz S.; Fritzsche, Stephan; Berrah, Nora

2018-02-01

We measured the fluorescence photon yield of neon upon soft x-ray ionization (∼1200 eV) from the x-ray free-electron laser at Linac Coherent Light Source, and demonstrated the usage of a grazing incidence spectrometer with a variable line spacing grating to perform x-ray fluorescence spectroscopy on a gas phase system. Our measurements also allowed us to estimate the focal size of the beam from the theoretical description developed, in terms of the rate equation approximation accounting for photoionization shake off of neutral neon and double auger decay of single core holes.

X-Ray Diffraction and Fluorescence Measurements for In Situ Planetary Instruments

NASA Astrophysics Data System (ADS)

Hansford, G.; Hill, K. S.; Talboys, D.; Vernon, D.; Ambrosi, R.; Bridges, J.; Hutchinson, I.; Marinangeli, L.

2011-12-01

The ESA/NASA ExoMars mission, due for launch in 2018, has a combined X-ray fluorescence/diffraction instrument, Mars-XRD, as part of the onboard analytical laboratory. The results of some XRF (X-ray fluorescence) and XRD (X-ray diffraction) tests using a laboratory chamber with representative performance are reported. A range of standard geological reference materials and analogues were used in these tests. The XRD instruments are core components of the forthcoming NASA Mars Science Laboratory (MSL) and ESA/NASA ExoMars missions and will provide the first demonstrations of the capabilities of combined XRD/XRF instrumentation in situ on an extraterrestrial planetary surface. The University of Leicester team is part of the Italy-UK collaboration that is responsible for building the ExoMars X-ray diffraction instrument, Mars-XRD [1,2]. Mars-XRD incorporates an Fe-55 radioisotope source and three fixed-position charge-coupled devices (CCDs) to simultaneously acquire an X-ray fluorescence spectrum and a diffraction pattern providing a measurement of both elemental and mineralogical composition. The CCDs cover an angular range of 2θ = 6° to 73° enabling the analysis of a wide range of geologically important minerals including phyllosilicates, feldspars, oxides, carbonates and evaporites. The identification of hydrous minerals may help identify past Martian hydrothermal systems capable of preserving traces of life. Here we present some initial findings from XRF and XRD tests carried out at the University of Leicester using an Fe-55 source and X-ray sensitive CCD. The XRF/XRD test system consists of a single CCD on a motorised arm, an Fe-55 X-ray source, a collimator and a sample table which approximately replicate the reflection geometry of the Mars-XRD instrument. It was used to test geological reference standard materials and Martian analogues. This work was funded by the Science and Technology Facilities Council, UK. References [1] Marinangeli, L., Hutchinson, I

Density Measurement for MORB Melts by X-ray Absorption Method

NASA Astrophysics Data System (ADS)

Sakamaki, T.; Urakawa, S.; Suzuki, A.; Ohtani, E.; Katayama, Y.

2006-12-01

Density of silicate melts at high pressure is one of the most important properties to understand magma migration in the planetary interior and the differentiation of the terrestrial planets. The density measurements of silicate melts have been carried out by several methods (shock compression experiments and sink-float method in static experiments, etc.). However, since these methods have difficulties in acquisition of data at a desired pressure and temperature, the density of the silicate melt have been measured under only a few conditions. Recently a new density measurement was developed by the X-ray absorption method. Advantage of this method is to measure density of liquids at a desired pressure and temperature. In the present study we measured the density of MORB melt by X-ray absorption method. Experiments were carried out at the BL22XU beamline at SPring-8. A DIA-type cubic anvil apparatus was used for generation of high pressure and temperature. We used tungsten carbide anvils with the top anvil sizes of 6 mm and 4 mm. The energy of monochromateized X-ray beam was 23 keV. The intensities of incident and transmitted X-ray were measured by ion chambers. The density of the melt was calculated on the basis of Beer-Lambert law. The starting material was a glass with the MORB composition. Experiments were made from 1 atm to 5 GPa, from 300 to 2000 K. We compared the density of MORB melt with the compression curve of the melt in previous works. The density measured by this study is lower than that expected from the compression curve determined at higher pressures by the sink-float method. Structural change of the MORB melt with increasing pressure might be attributed to this discrepancy.

Density Measurement for MORB Melts by X-ray Absorption Method

NASA Astrophysics Data System (ADS)

Sakamaki, T.; Urakawa, S.; Ohtani, E.; Suzuki, A.; Katayama, Y.

2005-12-01

Density of silicate melts at high pressure is one of the most important properties to understand magma migration in the planetary interior and the differentiation of the terrestrial planets. The density measurements of silicate melts have been carried out by several methods (shock compression experiments and sink-float method in static experiments, etc.). However, since these methods have difficulties in acquisition of data at a desired pressure and temperature, the density of the silicate melt have been measured under only a few conditions. Recently a new density measurement was developed by the X-ray absorption method. Advantage of this method is to measure density of liquids at a desired pressure and temperature. In the present study we measured the density of MORB melt by X-ray absorption method. Experiments were carried out at the BL22XU beamline at SPring-8. A DIA-type cubic anvil apparatus was used for generation of high pressure and temperature. We used tungsten carbide anvils with the edge-length of 6 mm. The energy of monochromateized X-ray beam was 23 keV. The intensities of incident and transmitted X-ray were measured by ion chambers. The density of the melt was calculated on the basis of Beer-Lambert law. The starting material was a glass with the MORB composition. Experiments were made from 1 atm to 4 GPa, from 300 to 2200 K. We compared the density of MORB melt with the compression curve of the melt in previous works. The density measured by this study is lower than that expected from the compression curve determined at higher pressures by the sink-float method. Structural change of the MORB melt with increasing pressure might be attributed to this discrepancy.

Study of interface correlation in W/C multilayer structure by specular and non-specular grazing incidence X-ray reflectivity measurements

DOE Office of Scientific and Technical Information (OSTI.GOV)

Biswas, A., E-mail: arupb@barc.gov.in; Bhattacharyya, D.; Sahoo, N. K.

2015-10-28

W/C/W tri-layer thin film samples have been deposited on c-Si substrates in a home-built Ion Beam Sputtering system at 1.5 × 10{sup −3} Torr Ar working pressure and 10 mA grid current. The tri-layer samples have been deposited at different Ar{sup +} ion energies between 0.6 and 1.2 keV for W layer deposition and the samples have been characterized by specular and non-specular grazing incidence X-ray reflectivity (GIXR) measurements. By analyzing the GIXR spectra, various interface parameters have been obtained for both W-on-C and C-on-W interfaces and optimum Ar{sup +} ion energy for obtaining interfaces with low imperfections has been found. Subsequently, multilayermore » W/C samples with 5-layer, 7-layer, 9-layer, and 13-layer have been deposited at this optimum Ar{sup +} ion energy. By fitting the specular and diffused GIXR data of the multilayer samples with the parameters of each interface as fitting variables, different interface parameters, viz., interface width, in-plane correlation length, interface roughness, and interface diffusion have been estimated for each interface and their variation across the depth of the multilayers have been obtained. The information would be useful in realizing W/C multilayers for soft X-ray mirror application in the <100 Å wavelength regime. The applicability of the “restart of the growth at the interface” model in the case of these ion beam sputter deposited W/C multilayers has also been investigated in the course of this study.« less

X-ray fluorescence measurements of dissolved gas and cavitation

DOE PAGES

Duke, Daniel J.; Kastengren, Alan L.; Swantek, Andrew B.; ...

2016-09-28

The dynamics of dissolved gas and cavitation are strongly coupled, yet these phenomena are difficult to measure in-situ. Both create voids in the fluid that can be difficult to distinguish. In this paper, we present an application of X-ray fluorescence in which liquid density and total noncondensible gas concentration (both dissolved and nucleated) are simultaneously measured. The liquid phase is doped with 400 ppm of a bromine tracer, and dissolved air is removed and substituted with krypton. Fluorescent emission at X-ray wavelengths is simultaneously excited from the Br and Kr with a focused monochromatic X-ray beam from a synchrotron source.more » We measure the flow in a cavitating nozzle 0.5 mm in diameter. From Br fluorescence, total displacement of the liquid is measured. From Kr fluorescence, the mass fraction of both dissolved and nucleated gas is measured. Volumetric displacement of liquid due to both cavitation and gas precipitation can be separated through estimation of the local equilibrium dissolved mass fraction. The uncertainty in the line of sight projected densities of the liquid and gas phases is 4–6 %. The high fluorescence yields and energies of Br and Kr allow small mass fractions of gas to be measured, down to 10 -5, with an uncertainty of 8 %. Finally, these quantitative measurements complement existing optical diagnostic techniques and provide new insight into the diffusion of gas into cavitation bubbles, which can increase their internal density, pressure and lifetimes by orders of magnitude.« less

X-ray scattering study

NASA Technical Reports Server (NTRS)

Wriston, R. S.; Froechtenigt, J. F.

1972-01-01

A soft X-ray glancing incidence telescope mirror and a group of twelve optical flat samples were used to study the scattering of X-rays. The mirror was made of Kanigen coated beryllium and the images produced were severely limited by scattering of X-rays. The best resolution attained was about fifteen arc seconds. The telescope efficiency was found to be 0.0006. The X-ray beam reflected from the twelve optical flat samples was analyzed by means of a long vacuum system of special design for these tests. The scattering then decreased with increasing angle of incidence until a critical angle was passed. At larger angles the scattering increased again. The samples all scattered more at 44 A than at 8 A. Metal samples were found to have about the same scattering at 44 A but greater scattering at 8 A than glass samples.

NUSTAR and SUZAKU X-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

DOE PAGES

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.; ...

2015-06-15

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spinmore » $$a\\gt 0.9$$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. As a result, we discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.« less

NUSTAR and SUZAKU X-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

DOE Office of Scientific and Technical Information (OSTI.GOV)

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spinmore » $$a\\gt 0.9$$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. As a result, we discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.« less

Phase-sensitive X-ray imager

DOEpatents

Baker, Kevin Louis

2013-01-08

X-ray phase sensitive wave-front sensor techniques are detailed that are capable of measuring the entire two-dimensional x-ray electric field, both the amplitude and phase, with a single measurement. These Hartmann sensing and 2-D Shear interferometry wave-front sensors do not require a temporally coherent source and are therefore compatible with x-ray tubes and also with laser-produced or x-pinch x-ray sources.

Soil emissivity and reflectance spectra measurements

DOE Office of Scientific and Technical Information (OSTI.GOV)

Sobrino, Jose A.; Mattar, Cristian; Pardo, Pablo

We present an analysis of the laboratory reflectance and emissivity spectra of 11 soil samples collected on different field campaigns carried out over a diverse suite of test sites in Europe, North Africa, and South America from 2002 to 2008. Hemispherical reflectance spectra were measured from 2.0 to 14 {mu}m with a Fourier transform infrared spectrometer, and x-ray diffraction analysis (XRD) was used to determine the mineralogical phases of the soil samples. Emissivity spectra were obtained from the hemispherical reflectance measurements using Kirchhoff's law and compared with in situ radiance measurements obtained with a CIMEL Electronique CE312-2 thermal radiometer andmore » converted to emissivity using the Advanced Spaceborne Thermal Emission and Reflection Radiometer (ASTER) temperature and emissivity separation algorithm. The CIMEL has five narrow bands at approximately the same positions as the ASTER. Results show a root mean square error typically below 0.015 between laboratory emissivity measurements and emissivity measurements derived from the field radiometer.« less

X-ray astronomical spectroscopy

NASA Technical Reports Server (NTRS)

Holt, Stephen S.

1987-01-01

The contributions of the Goddard group to the history of X-ray astronomy are numerous and varied. One role that the group has continued to play involves the pursuit of techniques for the measurement and interpretation of the X-ray spectra of cosmic sources. The latest development is the selection of the X-ray microcalorimeter for the Advanced X-ray Astrophysics Facility (AXAF) study payload. This technology is likely to revolutionize the study of cosmic X-ray spectra.

Protection of the electronic components of measuring equipment from the X-ray radiation

NASA Astrophysics Data System (ADS)

Perez Vasquez, N. O.; Kostrin, D. K.; Uhov, A. A.

2018-02-01

In this work the effect of X-ray radiation on the operation of integrated circuits of the measurement equipment is discussed. The results of the calculations of a shielding system, allowing using integrated circuits with a high degree of integration in the vicinity of the X-ray source, are shown. The results of the verification of two measurement devices that was used for more than five years in the facility for training and testing of X-ray tubes are presented.

X-ray and gamma ray astronomy detectors

NASA Technical Reports Server (NTRS)

Decher, Rudolf; Ramsey, Brian D.; Austin, Robert

1994-01-01

X-ray and gamma ray astronomy was made possible by the advent of space flight. Discovery and early observations of celestial x-rays and gamma rays, dating back almost 40 years, were first done with high altitude rockets, followed by Earth-orbiting satellites> once it became possible to carry detectors above the Earth's atmosphere, a new view of the universe in the high-energy part of the electromagnetic spectrum evolved. Many of the detector concepts used for x-ray and gamma ray astronomy were derived from radiation measuring instruments used in atomic physics, nuclear physics, and other fields. However, these instruments, when used in x-ray and gamma ray astronomy, have to meet unique and demanding requirements related to their operation in space and the need to detect and measure extremely weak radiation fluxes from celestial x-ray and gamma ray sources. Their design for x-ray and gamma ray astronomy has, therefore, become a rather specialized and rapidly advancing field in which improved sensitivity, higher energy and spatial resolution, wider spectral coverage, and enhanced imaging capabilities are all sought. This text is intended as an introduction to x-ray and gamma ray astronomy instruments. It provides an overview of detector design and technology and is aimed at scientists, engineers, and technical personnel and managers associated with this field. The discussion is limited to basic principles and design concepts and provides examples of applications in past, present, and future space flight missions.

History of Chandra X-Ray Observatory

NASA Image and Video Library

2000-04-01

This Chandra X-Ray Observatory (CXO) image is a spectrum of a black hole, which is similar to the colorful spectrum of sunlight produced by a prism. The x-rays of interest are shown here recorded in bright stripes that run rightward and leftward from the center of the image. These x-rays are sorted precisely according to their energy with the highest-energy x-rays near the center of the image and the lower-energy x-rays farther out. The spectrum was obtained by using the Low Energy Transmission Grating (LETG), which intercepts x-rays and changes their direction by the amounts that depend sensitively on the x-ray energy. The assembly holds 540 gold transmission gratings. When in place behind the mirrors, the gratings intercept the x-rays reflected from the telescope. The bright spot at the center is due to a fraction of the x-ray radiation that is not deflected by the LETG. The spokes that intersect the central spot and the faint diagonal rays that flank the spectrum itself are artifacts due to the structure that supports the LETG grating elements. (Photo credit: NASA Cfa/J. McClintock et al)

NuSTAR and Suzaku X-ray Spectroscopy of NGC 4151: Evidence for Reflection from the Inner Accretion Disk

NASA Astrophysics Data System (ADS)

Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.; Bauer, F.; Boggs, S. E.; Christensen, F. E.; Craig, W. W.; Dauser, T.; Elvis, M.; Fabian, A. C.; Fuerst, F.; García, J.; Grefenstette, B. W.; Hailey, C. J.; Harrison, F. A.; Madejski, G.; Marinucci, A.; Matt, G.; Reynolds, C. S.; Stern, D.; Walton, D. J.; Zoghbi, A.

2015-06-01

We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spin a\\gt 0.9 accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. We discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.

Multilayer X-ray imaging systems

NASA Astrophysics Data System (ADS)

Shealy, D. L.; Hoover, R. B.; Gabardi, D. R.

1986-01-01

An assessment of the imaging properties of multilayer X-ray imaging systems with spherical surfaces has been made. A ray trace analysis was performed to investigate the effects of using spherical substrates (rather than the conventional paraboloidal/hyperboloidal contours) for doubly reflecting Cassegrain telescopes. These investigations were carried out for mirrors designed to operate at selected soft X-ray/XUV wavelengths that are of significance for studies of the solar corona/transition region from the Stanford/MSFC Rocket X-Ray Telescope. The effects of changes in separation of the primary and secondary elements were also investigated. These theoretical results are presented as well as the results of ray trace studies to establish the resolution and vignetting effects as a function of field angle and system parameters.

Impact of Lipid Oxidization on Vertical Structures and Electrostatics of Phospholipid Monolayers Revealed by Combination of Specular X-ray Reflectivity and Grazing-Incidence X-ray Fluorescence.

PubMed

Korytowski, Agatha; Abuillan, Wasim; Makky, Ali; Konovalov, Oleg; Tanaka, Motomu

2015-07-30

The influence of phospholipid oxidization of floating monolayers on the structure perpendicular to the global plane and on the density profiles of ions near the lipid monolayer has been investigated by a combination of grazing incidence X-ray fluorescence (GIXF) and specular X-ray reflectivity (XRR). Systematic variation of the composition of the floating monolayers unravels changes in the thickness, roughness and electron density of the lipid monolayers as a function of molar fraction of oxidized phospholipids. Simultaneous GIXF measurements enable one to qualitatively determine the element-specific density profiles of monovalent (K(+) or Cs(+)) and divalent ions (Ca(2+)) in the vicinity of the interface in the presence and absence of two types of oxidized phospholipids (PazePC and PoxnoPC) with high spatial accuracy (±5 Å). We found the condensation of Ca(2+) near carboxylated PazePC was more pronounced compared to PoxnoPC with an aldehyde group. In contrast, the condensation of monovalent ions could hardly be detected even for pure oxidized phospholipid monolayers. Moreover, pure phospholipid monolayers exhibited almost no ion specific condensation near the interface. The quantitative studies with well-defined floating monolayers revealed how the elevation of lipid oxidization level alters the structures and functions of cell membranes.

Measurement of strain in Al-Cu interconnect lines with x-ray microdiffraction

NASA Astrophysics Data System (ADS)

Solak, H. H.; Vladimirsky, Y.; Cerrina, F.; Lai, B.; Yun, W.; Cai, Z.; Ilinski, P.; Legnini, D.; Rodrigues, W.

1999-07-01

We report measurement of strain in patterned Al-Cu interconnect lines with x-ray microdiffraction technique with a ˜1 μm spatial resolution. Monochromatized x rays from an undulator were focused on the sample using a phase fresnel zone plate and diffracted light was collected by an area detector in a symmetric, angle dispersive x-ray diffraction geometry. Measurements were made before and after the line sample was stressed for electromigration. Results show an increase in inter- and intra-grain strain variation after the testing. Differences in strain behavior of grains with (111) and (200) crystallographic planes parallel to the substrate surface were observed. A position dependent variation of strain after the testing was measured whereas no such dependence was found before the testing.

Water window imaging x ray microscope

NASA Technical Reports Server (NTRS)

Hoover, Richard B. (Inventor)

1992-01-01

A high resolution x ray microscope for imaging microscopic structures within biological specimens has an optical system including a highly polished primary and secondary mirror coated with identical multilayer coatings, the mirrors acting at normal incidence. The coatings have a high reflectivity in the narrow wave bandpass between 23.3 and 43.7 angstroms and have low reflectivity outside of this range. The primary mirror has a spherical concave surface and the secondary mirror has a spherical convex surface. The radii of the mirrors are concentric about a common center of curvature on the optical axis of the microscope extending from the object focal plane to the image focal plane. The primary mirror has an annular configuration with a central aperture and the secondary mirror is positioned between the primary mirror and the center of curvature for reflecting radiation through the aperture to a detector. An x ray filter is mounted at the stage end of the microscope, and film sensitive to x rays in the desired band width is mounted in a camera at the image plane of the optical system. The microscope is mounted within a vacuum chamber for minimizing the absorption of x rays in air from a source through the microscope.

Cone-beam x-ray luminescence computed tomography based on x-ray absorption dosage

NASA Astrophysics Data System (ADS)

Liu, Tianshuai; Rong, Junyan; Gao, Peng; Zhang, Wenli; Liu, Wenlei; Zhang, Yuanke; Lu, Hongbing

2018-02-01

With the advances of x-ray excitable nanophosphors, x-ray luminescence computed tomography (XLCT) has become a promising hybrid imaging modality. In particular, a cone-beam XLCT (CB-XLCT) system has demonstrated its potential in in vivo imaging with the advantage of fast imaging speed over other XLCT systems. Currently, the imaging models of most XLCT systems assume that nanophosphors emit light based on the intensity distribution of x-ray within the object, not completely reflecting the nature of the x-ray excitation process. To improve the imaging quality of CB-XLCT, an imaging model that adopts an excitation model of nanophosphors based on x-ray absorption dosage is proposed in this study. To solve the ill-posed inverse problem, a reconstruction algorithm that combines the adaptive Tikhonov regularization method with the imaging model is implemented for CB-XLCT reconstruction. Numerical simulations and phantom experiments indicate that compared with the traditional forward model based on x-ray intensity, the proposed dose-based model could improve the image quality of CB-XLCT significantly in terms of target shape, localization accuracy, and image contrast. In addition, the proposed model behaves better in distinguishing closer targets, demonstrating its advantage in improving spatial resolution.

Cone-beam x-ray luminescence computed tomography based on x-ray absorption dosage.

PubMed

Liu, Tianshuai; Rong, Junyan; Gao, Peng; Zhang, Wenli; Liu, Wenlei; Zhang, Yuanke; Lu, Hongbing

2018-02-01

With the advances of x-ray excitable nanophosphors, x-ray luminescence computed tomography (XLCT) has become a promising hybrid imaging modality. In particular, a cone-beam XLCT (CB-XLCT) system has demonstrated its potential in in vivo imaging with the advantage of fast imaging speed over other XLCT systems. Currently, the imaging models of most XLCT systems assume that nanophosphors emit light based on the intensity distribution of x-ray within the object, not completely reflecting the nature of the x-ray excitation process. To improve the imaging quality of CB-XLCT, an imaging model that adopts an excitation model of nanophosphors based on x-ray absorption dosage is proposed in this study. To solve the ill-posed inverse problem, a reconstruction algorithm that combines the adaptive Tikhonov regularization method with the imaging model is implemented for CB-XLCT reconstruction. Numerical simulations and phantom experiments indicate that compared with the traditional forward model based on x-ray intensity, the proposed dose-based model could improve the image quality of CB-XLCT significantly in terms of target shape, localization accuracy, and image contrast. In addition, the proposed model behaves better in distinguishing closer targets, demonstrating its advantage in improving spatial resolution. (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).

Measurement and Interpretation of Diffuse Scattering in X-Ray Diffraction for Macromolecular Crystallography

DOE Office of Scientific and Technical Information (OSTI.GOV)

Wall, Michael E.

X-ray diffraction from macromolecular crystals includes both sharply peaked Bragg reflections and diffuse intensity between the peaks. The information in Bragg scattering reflects the mean electron density in the unit cells of the crystal. The diffuse scattering arises from correlations in the variations of electron density that may occur from one unit cell to another, and therefore contains information about collective motions in proteins.

Electroform replication used for multiple X-ray mirror production

NASA Technical Reports Server (NTRS)

Kowalski, M. P.; Ulmer, M. P.; Purcell, W. R., Jr.; Loughlin, J. E. A.

1984-01-01

The electroforming technique for producing X-ray mirrors is described, and results of X-ray tests performed on copies made from a simple conical mandrel are reported. The design of the mandrel is depicted and the total reflectivity as well as the full-wave half modulation resolution are shown as a function of energy. The reported work has improved on previous studies by providing smaller grazing angles, making measurements at higher energies, producing about four times as many replicas from one mandrel, and obtaining better angular resolution.

A new endstation at the Swiss Light Source for ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy, and X-ray absorption spectroscopy measurements of liquid solutions.

PubMed

Brown, Matthew A; Redondo, Amaia Beloqui; Jordan, Inga; Duyckaerts, Nicolas; Lee, Ming-Tao; Ammann, Markus; Nolting, Frithjof; Kleibert, Armin; Huthwelker, Thomas; Müächler, Jean-Pierre; Birrer, Mario; Honegger, Juri; Wetter, Reto; Wörner, Hans Jakob; van Bokhoven, Jeroen A

2013-07-01

A new liquid microjet endstation designed for ultraviolet (UPS) and X-ray (XPS) photoelectron, and partial electron yield X-ray absorption (XAS) spectroscopies at the Swiss Light Source is presented. The new endstation, which is based on a Scienta HiPP-2 R4000 electron spectrometer, is the first liquid microjet endstation capable of operating in vacuum and in ambient pressures up to the equilibrium vapor pressure of liquid water at room temperature. In addition, the Scienta HiPP-2 R4000 energy analyzer of this new endstation allows for XPS measurements up to 7000 eV electron kinetic energy that will enable electronic structure measurements of bulk solutions and buried interfaces from liquid microjet samples. The endstation is designed to operate at the soft X-ray SIM beamline and at the tender X-ray Phoenix beamline. The endstation can also be operated using a Scienta 5 K ultraviolet helium lamp for dedicated UPS measurements at the vapor-liquid interface using either He I or He II α lines. The design concept, first results from UPS, soft X-ray XPS, and partial electron yield XAS measurements, and an outlook to the potential of this endstation are presented.

Observation of femtosecond X-ray interactions with matter using an X-ray–X-ray pump–probe scheme

PubMed Central

Inoue, Ichiro; Inubushi, Yuichi; Sato, Takahiro; Tono, Kensuke; Katayama, Tetsuo; Kameshima, Takashi; Ogawa, Kanade; Togashi, Tadashi; Owada, Shigeki; Amemiya, Yoshiyuki; Tanaka, Takashi; Hara, Toru

2016-01-01

Resolution in the X-ray structure determination of noncrystalline samples has been limited to several tens of nanometers, because deep X-ray irradiation required for enhanced resolution causes radiation damage to samples. However, theoretical studies predict that the femtosecond (fs) durations of X-ray free-electron laser (XFEL) pulses make it possible to record scattering signals before the initiation of X-ray damage processes; thus, an ultraintense X-ray beam can be used beyond the conventional limit of radiation dose. Here, we verify this scenario by directly observing femtosecond X-ray damage processes in diamond irradiated with extraordinarily intense (∼1019 W/cm2) XFEL pulses. An X-ray pump–probe diffraction scheme was developed in this study; tightly focused double–5-fs XFEL pulses with time separations ranging from sub-fs to 80 fs were used to excite (i.e., pump) the diamond and characterize (i.e., probe) the temporal changes of the crystalline structures through Bragg reflection. It was found that the pump and probe diffraction intensities remain almost constant for shorter time separations of the double pulse, whereas the probe diffraction intensities decreased after 20 fs following pump pulse irradiation due to the X-ray–induced atomic displacement. This result indicates that sub-10-fs XFEL pulses enable conductions of damageless structural determinations and supports the validity of the theoretical predictions of ultraintense X-ray–matter interactions. The X-ray pump–probe scheme demonstrated here would be effective for understanding ultraintense X-ray–matter interactions, which will greatly stimulate advanced XFEL applications, such as atomic structure determination of a single molecule and generation of exotic matters with high energy densities. PMID:26811449

Development of x-ray laminography under an x-ray microscopic condition

DOE Office of Scientific and Technical Information (OSTI.GOV)

Hoshino, Masato; Uesugi, Kentaro; Takeuchi, Akihisa

2011-07-15

An x-ray laminography system under an x-ray microscopic condition was developed to obtain a three-dimensional structure of laterally-extended planar objects which were difficult to observe by x-ray tomography. An x-ray laminography technique was introduced to an x-ray transmission microscope with zone plate optics. Three prototype sample holders were evaluated for x-ray imaging laminography. Layered copper grid sheets were imaged as a laminated sample. Diatomite powder on a silicon nitride membrane was measured to confirm the applicability of this method to non-planar micro-specimens placed on the membrane. The three-dimensional information of diatom shells on the membrane was obtained at a spatialmore » resolution of sub-micron. Images of biological cells on the membrane were also obtained by using a Zernike phase contrast technique.« less

Determination of copper nanoparticle size distributions with total reflection X-ray fluorescence spectroscopy

DOE PAGES

Singh, Andy; Luening, Katharina; Brennan, Sean; ...

2017-01-01

Total reflection X-ray fluorescence (TXRF) analysis is extensively used by the semiconductor industry for measuring trace metal contamination on silicon surfaces. In addition to determining the quantity of impurities on a surface, TXRF can reveal information about the vertical distribution of contaminants by measuring the fluorescence signal as a function of the angle of incidence. In this study, two samples were intentionally contaminated with copper in non-deoxygenated and deoxygenated ultrapure water (UPW) resulting in impurity profiles that were either atomically dispersed in a thin film or particle-like, respectively. The concentration profile of the samples immersed into deoxygenated UPW was calculatedmore » using a theoretical concentration profile representative of particles, yielding a mean particle height of 16.1 nm. However, the resulting theoretical profile suggested that a distribution of particle heights exists on the surface. The fit of the angular distribution data was further refined by minimizing the residual error of a least-squares fit employing a model with a Gaussian distribution of particle heights about the mean height. The presence of a height distribution was also confirmed with atomic force microscopy measurements.« less

Determination of copper nanoparticle size distributions with total reflection X-ray fluorescence spectroscopy

DOE Office of Scientific and Technical Information (OSTI.GOV)

Singh, Andy; Luening, Katharina; Brennan, Sean

Total reflection X-ray fluorescence (TXRF) analysis is extensively used by the semiconductor industry for measuring trace metal contamination on silicon surfaces. In addition to determining the quantity of impurities on a surface, TXRF can reveal information about the vertical distribution of contaminants by measuring the fluorescence signal as a function of the angle of incidence. In this study, two samples were intentionally contaminated with copper in non-deoxygenated and deoxygenated ultrapure water (UPW) resulting in impurity profiles that were either atomically dispersed in a thin film or particle-like, respectively. The concentration profile of the samples immersed into deoxygenated UPW was calculatedmore » using a theoretical concentration profile representative of particles, yielding a mean particle height of 16.1 nm. However, the resulting theoretical profile suggested that a distribution of particle heights exists on the surface. The fit of the angular distribution data was further refined by minimizing the residual error of a least-squares fit employing a model with a Gaussian distribution of particle heights about the mean height. The presence of a height distribution was also confirmed with atomic force microscopy measurements.« less

Cosmic X-ray physics

NASA Technical Reports Server (NTRS)

Mccammon, D.; Cox, D. P.; Kraushaar, W. L.; Sanders, W. T.

1985-01-01

A progress report of research activities carried out in the area of cosmic X-ray physics is presented. The Diffuse X-ray Spectrometer DXS which has been flown twice as a rocket payload is described. The observation times proved to be too small for meaningful X-ray data to be obtained. Data collection and reduction activities from the Ultra-Soft X-ray background (UXT) instrument are described. UXT consists of three mechanically-collimated X-ray gas proportional counters with window/filter combinations which allow measurements in three energy bands, Be (80-110 eV), B (90-187 eV), and O (e84-532 eV). The Be band measurements provide an important constraint on local absorption of X-rays from the hot component of the local interstellar medium. Work has also continued on the development of a calorimetric detector for high-resolution spectroscopy in the 0.1 keV - 8keV energy range.

Wide Bandgap Semiconductor Detector Optimization for Flash X-Ray Measurements

DOE Office of Scientific and Technical Information (OSTI.GOV)

Roecker, Caleb Daniel; Schirato, Richard C.

2017-11-17

Charge trapping, resulting in a decreased and spatially dependent electric field, has long been a concern for wide bandgap semiconductor detectors. While significant work has been performed to characterize this degradation at varying temperatures and radiation environments, this work concentrates upon examining the event-to-event response in a flash X-ray environment. The following work investigates if charge trapping is a problem for CZT detectors, with particular emphasis on flash X-ray radiation fields at cold temperatures. Results are compared to a non-flash radiation field, using an Am-241 alpha source and similar temperature transitions. Our ability to determine if a response change occurredmore » was hampered by the repeatability of our flash X-ray systems; a small response change was observed with the Am-241 source. Due to contrast of these results, we are in the process of revisiting the Am-241 measurements in the presence of a high radiation environment. If the response change is more pronounced in the high radiation environment, a similar test will be performed in the flash X-ray environment.« less

Chandra X-ray Observatory - NASA's flagship X-ray telescope

Science.gov Websites

astronomy, taking its place in the fleet of "Great Observatories." Who we are NASA's Chandra X-ray astronomy, distances are measured in units of light years, where one light year is the distance that light gravity? The answer is still out there. By studying clusters of galaxies, X-ray astronomy is tackling this

Diamond sensors and polycapillary lenses for X-ray absorption spectroscopy.

PubMed

Ravel, B; Attenkofer, K; Bohon, J; Muller, E; Smedley, J

2013-10-01

Diamond sensors are evaluated as incident beam monitors for X-ray absorption spectroscopy experiments. These single crystal devices pose a challenge for an energy-scanning experiment using hard X-rays due to the effect of diffraction from the crystalline sensor at energies which meet the Bragg condition. This problem is eliminated by combination with polycapillary lenses. The convergence angle of the beam exiting the lens is large compared to rocking curve widths of the diamond. A ray exiting one capillary from the lens meets the Bragg condition for any reflection at a different energy from the rays exiting adjacent capillaries. This serves to broaden each diffraction peak over a wide energy range, allowing linear measurement of incident intensity over the range of the energy scan. Extended X-ray absorption fine structure data are measured with a combination of a polycapillary lens and a diamond incident beam monitor. These data are of comparable quality to data measured without a lens and with an ionization chamber monitoring the incident beam intensity.

Use of a priori spectral information in the measurement of x-ray flux with filtered diode arrays

DOE PAGES

Marrs, R. E.; Widmann, K.; Brown, G. V.; ...

2015-10-29

Filtered x-ray diode (XRD) arrays are often used to measure x-ray spectra vs. time from spectrally continuous x-ray sources such as hohlraums. A priori models of the incident x-ray spectrum enable a more accurate unfolding of the x-ray flux as compared to the standard technique of modifying a thermal Planckian with spectral peaks or dips at the response energy of each filtered XRD channel. A model x-ray spectrum consisting of a thermal Planckian, a Gaussian at higher energy, and (in some cases) a high energy background provides an excellent fit to XRD-array measurements of x-ray emission from laser heated hohlraums.more » If high-resolution measurements of part of the x-ray emission spectrum are available, that information can be included in the a priori model. In cases where the x-ray emission spectrum is not Planckian, candidate x-ray spectra can be allowed or excluded by fitting them to measured XRD voltages. Here, examples are presented from the filtered XRD arrays, named Dante, at the National Ignition Facility and the Laboratory for Laser Energetics.« less

Off-plane x-ray reflection grating fabrication

NASA Astrophysics Data System (ADS)

Peterson, Thomas J.; DeRoo, Casey T.; Marlowe, Hannah; McEntaffer, Randall L.; Miles, Drew M.; Tutt, James H.; Schultz, Ted B.

2015-09-01

Off-plane X-ray diffraction gratings with precision groove profiles at the submicron scale will be used in next generation X-ray spectrometers. Such gratings will be used on a current NASA suborbital rocket mission, the Off-plane Grating Rocket Experiment (OGRE), and have application for future grating missions. The fabrication of these gratings does not come without challenges. High performance off-plane gratings must be fabricated with precise radial grating patterns, optically at surfaces, and specific facet angles. Such gratings can be made using a series of common micro-fabrication techniques. The resulting process is highly customizable, making it useful for a variety of different mission architectures. In this paper, we detail the fabrication method used to produce high performance off-plane gratings and report the results of a preliminary qualification test of a grating fabricated in this manner. The grating was tested in the off-plane `Littrow' configuration, for which the grating is most efficient for a given diffraction order, and found to achieve 42% relative efficiency in the blaze order with respect to all diffracted light.

"X-Ray Transients in Star-Forming Regions" and "Hard X-Ray Emission from X-Ray Bursters"

NASA Technical Reports Server (NTRS)

Halpern, Jules P.; Kaaret, Philip

1999-01-01

This grant funded work on the analysis of data obtained with the Burst and Transient Experiment (BATSE) on the Compton Gamma-Ray Observatory. The goal of the work was to search for hard x-ray transients in star forming regions using the all-sky hard x-ray monitoring capability of BATSE. Our initial work lead to the discovery of a hard x-ray transient, GRO J1849-03. Follow-up observations of this source made with the Wide Field Camera on BeppoSAX showed that the source should be identified with the previously known x-ray pulsar GS 1843-02 which itself is identified with the x-ray source X1845-024 originally discovered with the SAS-3 satellite. Our identification of the source and measurement of the outburst recurrence time, lead to the identification of the source as a Be/X-ray binary with a spin period of 94.8 s and an orbital period of 241 days. The funding was used primarily for partial salary and travel support for John Tomsick, then a graduate student at Columbia University. John Tomsick, now Dr. Tomsick, received his Ph.D. from Columbia University in July 1999, based partially on results obtained under this investigation. He is now a postdoctoral research scientist at the University of California, San Diego.

X-ray View of Four High-Luminosity Swift-BAT AGN: Unveiling Obscuration and Reflection with Suzaku

NASA Technical Reports Server (NTRS)

Fiorettil, V.; Angelini, L.; Mushotzky, R. F.; Koss, M.; Malaguti, G.

2013-01-01

Aims. A complete census of obscured Active Galactic Nuclei (AGN) is necessary to reveal the history of the super massive black hole (SMBH) growth and galaxy evolution in the Universe given the complex feedback processes and the fact that much of this growth occurs in an obscured phase. In this context, hard X-ray surveys and dedicated follow-up observations represent a unique tool for selecting highly absorbed AGN and for characterizing the obscuring matter surrounding the SMBH. Here we focus on the absorption and reflection occurring in highly luminous, quasar-like AGN, to study the relation between the geometry of the absorbing matter and the AGN nature (e.g. X-ray, optical, and radio properties), and to help to determine the column density dependency on the AGN luminosity. Methods. The Swift/BAT nine-month survey observed 153 AGN, all with ultra-hard X-ray BAT fluxes in excess of 10(exp -11) erg per square centimeter and an average redshift of 0.03. Among them, four of the most luminous BAT AGN (44.73 less than LogLBAT less than 45.31) were selected as targets of Suzaku follow-up observations: J2246.0+3941 (3C 452), J0407.4+0339 (3C 105), J0318.7+6828, and J0918.5+0425. The column density, scattered/reflected emission, the properties of the Fe K line, and a possible variability are fully analyzed. For the latter, the spectral properties from Chandra, XMM-Newton and Swift/XRT public observations were compared with the present Suzaku analysis, adding an original spectral analysis when non was available from the literature. Results. Of our sample, 3C 452 is the only certain Compton-thick AGN candidate because of i) the high absorption (N(sub H) approximately 4 × 10(exp 23) per square centimeter) and strong Compton reflection; ii) the lack of variability; iii) the "buried" nature, i.e. the low scattering fraction (less than 0.5%) and the extremely low relative [OIII] luminosity. In contrast 3C 105 is not reflection-dominated, despite the comparable column density

Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity.

PubMed

Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Theis-Bröhl, K; Devishvili, A; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C; Toperverg, B P; Zabel, H

2012-02-10

We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole-dipole interaction is rather strong, dominating the collective magnetic properties at room temperature.

Optical performance of W/B4C multilayer mirror in the soft x-ray region

NASA Astrophysics Data System (ADS)

Pradhan, P. C.; Majhi, A.; Nayak, M.

2018-03-01

W/B4C x-ray multilayers (MLs) with 300 layer pairs and a period in the range of d = 2-1.6 nm are fabricated and investigated for the x-ray optical element in the soft x-ray regime. The structural analyses of the MLs are carried out by using hard x-ray reflectivity (HXR) measurements at 8.047 keV. Well-defined successive higher order Bragg peaks (up to 3rd order) in HXR data collected up to glancing incidence angles of ˜9° reveal a good quality of the periodic structure. The ML mirrors have an average interface width of ˜0.35 nm and have a compressive residual stress of ˜0.183 GPa and 0. 827 GPa for d = 1.62 nm and d = 1.98 nm, respectively. MLs maintain structural stability over a long time, with a slight increase in interface widths of the W layers by 0.1 nm due to self-diffusion. Soft x-ray reflectivity (SXR) performances are evaluated in the energy range of 650 to 1500 eV. At energy ˜ 1489 eV, measured reflectivities (energy resolution, ΔE) are ˜ 10% (19 eV) and 4.5% (13 eV) at glancing incident angles of 12.07° and 15° for MLs having periods of 1.98 nm and 1.62 nm, respectively. The optical performance from 1600 eV to 4500 eV is theoretically analysed by considering the measured structural parameters. The structure-stress-optical performance is correlated on the basis of the mechanism of film growth. The implications of W/B4C MLs are discussed, particularly with respect to the development of ML optics with high spectral selectivity and reflectance for soft x-ray instruments.

Cosmic X-ray physics

NASA Technical Reports Server (NTRS)

Mccammon, D.; Cox, D. P.; Kraushaar, W. L.; Sanders, W. T.

1986-01-01

The analysis of the beryllium-filtered data from Flight 17.020 was completed. The data base provided by the Wisconsin diffuse X-ray sky survey is being analyzed by correlating the B and C band emission with individual velocity components of neutral hydrogen. Work on a solid state detector to be used in high resolution spectroscopy of diffuse or extend X-ray sources is continuing. A series of 21 cm observations was completed. A paper on the effects of process parameter variation on the reflectivity of sputter-deposited tungsten-carvon multilayers was published.

Projection x-ray topography system at 1-BM x-ray optics test beamline at the advanced photon source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Stoupin, Stanislav, E-mail: sstoupin@aps.anl.gov; Liu, Zunping; Trakhtenberg, Emil

2016-07-27

Projection X-ray topography of single crystals is a classic technique for the evaluation of intrinsic crystal quality of large crystals. In this technique a crystal sample and an area detector (e.g., X-ray film) collecting intensity of a chosen crystallographic reflection are translated simultaneously across an X-ray beam collimated in the diffraction scattering plane (e.g., [1, 2]). A bending magnet beamline of a third-generation synchrotron source delivering x-ray beam with a large horizontal divergence, and therefore, a large horizontal beam size at a crystal sample position offers an opportunity to obtain X-ray topographs of large crystalline samples (e.g., 6-inch wafers) inmore » just a few exposures. Here we report projection X-ray topography system implemented recently at 1-BM beamline of the Advanced Photon Source. A selected X-ray topograph of a 6-inch wafer of 4H-SiC illustrates capabilities and limitations of the technique.« less

ROSAT implementation of a proposed multi-mission x ray data format

NASA Technical Reports Server (NTRS)

Corcoran, M.; Pence, W.; White, R.; Conroy, M.

1992-01-01

Until recently little effort has been made to ensure that data from X-ray telescopes are delivered in a format that reflects the common characteristics that most X-ray datasets share. Instrument-specific data-product design hampers the comparison of X-ray measurements made by different detectors and should be avoided whenever possible. The ROSAT project and the High Energy Astrophysics Science Archive Research Center (HEASARC) have defined a set of X-ray data products ('rationalized files') for ROSAT data that can be used for distribution and archiving of data from other X-ray missions. This set of 'rationalized files' has been defined to isolate instrument-independent and instrument-specific quantities using standards FITS constructs to ensure portability. We discuss the usage of the 'rationalized files' by ROSAT for data distribution and archiving, with particular emphasis on discrimination between instrument-independent and instrument-specific quantities, and discuss application of this format to data from other X-ray missions.

NuSTAR SPECTROSCOPY OF MULTI-COMPONENT X-RAY REFLECTION FROM NGC 1068

DOE Office of Scientific and Technical Information (OSTI.GOV)

Bauer, Franz E.; Arévalo, Patricia; Walton, Dominic J.

2015-10-20

We report on high-energy X-ray observations of the Compton-thick Seyfert 2 galaxy NGC 1068 with NuSTAR, which provide the best constraints to date on its >10 keV spectral shape. The NuSTAR data are consistent with those from past and current instruments to within cross-calibration uncertainties, and we find no strong continuum or line variability over the past two decades, which is in line with its X-ray classification as a reflection-dominated Compton-thick active galactic nucleus. The combined NuSTAR, Chandra, XMM-Newton, and Swift BAT spectral data set offers new insights into the complex secondary emission seen instead of the completely obscured transmittedmore » nuclear continuum. The critical combination of the high signal-to-noise NuSTAR data and the decomposition of the nuclear and extranuclear emission with Chandra allow us to break several model degeneracies and greatly aid physical interpretation. When modeled as a monolithic (i.e., a single N{sub H}) reflector, none of the common Compton reflection models are able to match the neutral fluorescence lines and broad spectral shape of the Compton reflection hump without requiring unrealistic physical parameters (e.g., large Fe overabundances, inconsistent viewing angles, or poor fits to the spatially resolved spectra). A multi-component reflector with three distinct column densities (e.g., with best-fit values of N{sub H} of 1.4 × 10{sup 23}, 5.0 × 10{sup 24}, and 10{sup 25} cm{sup −2}) provides a more reasonable fit to the spectral lines and Compton hump, with near-solar Fe abundances. In this model, the higher N{sub H} component provides the bulk of the flux to the Compton hump, while the lower N{sub H} component produces much of the line emission, effectively decoupling two key features of Compton reflection. We find that ≈30% of the neutral Fe Kα line flux arises from >2″ (≈140 pc) and is clearly extended, implying that a significant fraction (and perhaps most) of the <10 keV reflected

The reflection spectrum of the low-mass X-ray binary 4U 1636-53

NASA Astrophysics Data System (ADS)

Wang, Yanan; Méndez, Mariano; Sanna, Andrea; Altamirano, Diego; Belloni, T. M.

2017-06-01

We present 3-79 keV NuSTAR observations of the neutron star low-mass X-ray binary 4U 1636-53 in the soft, transitional and hard state. The spectra display a broad emission line at 5-10 keV. We applied several models to fit this line: A Gaussian line, a relativistically broadened emission line model, kyrline, and two models including relativistically smeared and ionized reflection off the accretion disc with different coronal heights, relxill and relxilllp. All models fit the spectra well; however, the kyrline and relxill models yield an inclination of the accretion disc of ˜88° with respect to the line of sight, which is at odds with the fact that this source shows no dips or eclipses. The relxilllp model, on the other hand, gives a reasonable inclination of ˜56°. We discuss our results for these models in this source and the possible primary source of the hard X-rays.

Design of a normal incidence multilayer imaging x-ray microscope.

PubMed

Shealy, D L; Gabardi, D R; Hoover, R B; Walker, A B; Lindblom, J F; Barbee, T W

1989-01-01

Normal incidence multilayer Cassegrain x-ray telescopes were flown on the Stanford/MSFC Rocket X-Ray Spectroheliograph. These instruments produced high spatial resolution images of the Sun and conclusively demonstrated that doubly reflecting multilayer x-ray optical systems are feasible. The images indicated that aplanatic imaging soft x-ray /EUV microscopes should be achievable using multilayer optics technology. We have designed a doubly reflecting normal incidence multilayer imaging x-ray microscope based on the Schwarzschild configuration. The Schwarzschild microscope utilizes two spherical mirrors with concentric radii of curvature which are chosen such that the third-order spherical aberration and coma are minimized. We discuss the design of the microscope and the results of the optical system ray trace analysis which indicates that diffraction-limited performance with 600 Å spatial resolution should be obtainable over a 1 mm field of view at a wavelength of 100 Å. Fabrication of several imaging soft x-ray microscopes based upon these designs, for use in conjunction with x-ray telescopes and laser fusion research, is now in progress. High resolution aplanatic imaging x-ray microscopes using normal incidence multilayer x-ray mirrors should have many important applications in advanced x-ray astronomical instrumentation, x-ray lithography, biological, biomedical, metallurgical, and laser fusion research.

The geometry of three-dimensional measurement from paired coplanar x-ray images.

PubMed

Baumrind, S; Moffitt, F H; Curry, S

1983-10-01

This article outlines the geometric principles which underlie the process of making craniofacial measurements in three dimensions by combining information from pairs of coplanar x-ray images. The main focus is upon the rationale of the method rather than upon the computational details. We stress particularly the importance of having available accurate measurements as to the relative positions of the x-ray tubes and the film plane. The use of control arrays of radiopaque "points" whose projected images upon the film plane allow the retrospective calculation of the spatial relationship between the x-ray tubes and the film plane is explained. Finally, the question of correcting for movement of the subject between two films of an image pair is considered briefly.

X-ray surface dose measurements using TLD extrapolation.

PubMed

Kron, T; Elliot, A; Wong, T; Showell, G; Clubb, B; Metcalfe, P

1993-01-01

Surface dose measurements in therapeutic x-ray beams are of importance in determining the dose to the skin of patients undergoing radiotherapy. Measurements were performed in the 6-MV beam of a medical linear accelerator with LiF thermoluminescence dosimeters (TLD) using a solid water phantom. TLD chips (surface area 3.17 x 3.17 cm2) of three different thicknesses (0.230, 0.099, and 0.038 g/cm2) were used to extrapolate dose readings to an infinitesimally thin layer of LiF. This surface dose was measured for field sizes ranging from 1 x 1 cm2 to 40 x 40 cm2. The surface dose relative to maximum dose was found to be 10.0% for a field size of 5 x 5 cm2, 16.3% for 10 x 10 cm2, and 26.9% for 20 x 20 cm2. Using a 6-mm Perspex block tray in the beam increased the surface dose in these fields to 10.7%, 17.7%, and 34.2% respectively. Due to the small size of the TLD chips, TLD extrapolation is applicable also for intracavity and exit dose determinations. The technique used for in vivo dosimetry could provide clinicians information about the build up of dose up to 1-mm depth in addition to an extrapolated surface dose measurement.

Lacquer polishing of X-ray optics

NASA Technical Reports Server (NTRS)

Catura, R. C.; Joki, E. G.; Roethig, D. T.; Brookover, W. J.

1987-01-01

Techniques for polishing figured X-ray optics by a lacquer-coating process are described. This acrylic lacquer coating has been applied with an optical quality of an eighth-wave in red light and very effectively covers surface roughness with spatial wavelengths less than about 0.2 mm. Tungsten films have been deposited on the lacquer coatings to provide highly efficient X-ray reflectivity.

Micropore x-ray optics using anisotropic wet etching of (110) silicon wafers

DOE Office of Scientific and Technical Information (OSTI.GOV)

Ezoe, Yuichiro; Koshiishi, Masaki; Mita, Makoto

2006-12-10

To develop x-ray mirrors for micropore optics, smooth silicon (111)sidewalls obtained after anisotropic wet etching of a silicon (110) wafer were studied. A sample device with 19 {mu}m wide (111) sidewalls was fabricated using a 220 {mu}m thick silicon (110) wafer and potassium hydroxide solution. For what we believe to be the first time,x-ray reflection on the (111) sidewalls was detected in the angular response measurement. Compared to ray-tracing simulations, the surface roughness of the sidewalls was estimated to be 3-5 nm, which is consistent with the atomic force microscope and the surface profiler measurements.

Micropore x-ray optics using anisotropic wet etching of (110) silicon wafers.

PubMed

Ezoe, Yuichiro; Koshiishi, Masaki; Mita, Makoto; Mitsuda, Kazuhisa; Hoshino, Akio; Ishisaki, Yoshitaka; Yang, Zhen; Takano, Takayuki; Maeda, Ryutaro

2006-12-10

To develop x-ray mirrors for micropore optics, smooth silicon (111) sidewalls obtained after anisotropic wet etching of a silicon (110) wafer were studied. A sample device with 19 microm wide (111) sidewalls was fabricated using a 220 microm thick silicon (110) wafer and potassium hydroxide solution. For what we believe to be the first time, x-ray reflection on the (111) sidewalls was detected in the angular response measurement. Compared to ray-tracing simulations, the surface roughness of the sidewalls was estimated to be 3-5 nm, which is consistent with the atomic force microscope and the surface profiler measurements.

X-ray photonic microsystems for the manipulation of synchrotron light

DOE PAGES

Mukhopadhyay, D.; Walko, D. A.; Jung, I. W.; ...

2015-05-05

In this study, photonic microsystems played an essential role in the development of integrated photonic devices, thanks to their unique spatiotemporal control and spectral shaping capabilities. Similar capabilities to markedly control and manipulate X-ray radiation are highly desirable but practically impossible due to the massive size of the silicon single-crystal optics currently used. Here we show that micromechanical systems can be used as X-ray optics to create and preserve the spatial, temporal and spectral correlation of the X-rays. We demonstrate that, as X-ray reflective optics they can maintain the wavefront properties with nearly 100% reflectivity, and as a dynamic diffractivemore » optics they can generate nanosecond time windows with over 100-kHz repetition rates. Since X-ray photonic microsystems can be easily incorporated into lab-based and next-generation synchrotron X-ray sources, they bring unprecedented design flexibility for future dynamic and miniature X-ray optics for focusing, wavefront manipulation, multicolour dispersion, and pulse slicing.« less

Novel wide-field x-ray optics for space

NASA Astrophysics Data System (ADS)

Hudec, René; Pína, Ladislav; Inneman, Adolf

2017-11-01

We report on the program of design and development of innovative very wide field X-ray optics for space applications. We describe the idea of wide field X-ray optics of the lobster-eye type of both Angel and Schmidt arrangements. This optics was suggested in 70ies but not yet used in space experiment due to severe manufacturing problems. The lobster-eye X-ray optics may achieve up to 180 degrees (diameter) field of view at angular resolution of order of 1 arcmin. We report on various prototypes of lobster-eye X-ray lenses based on alternative technologies (replicated double sided X-ray reflecting flats, float glass, replicated square channels etc.) as well as on their optical and X-ray tests. We also discuss the importance and performance of lobster-eye X-ray telescopes in future X-ray astronomy projects.

Using absolute x-ray spectral measurements to infer stagnation conditions in ICF implosions

NASA Astrophysics Data System (ADS)

Patel, Pravesh; Benedetti, L. R.; Cerjan, C.; Clark, D. S.; Hurricane, O. A.; Izumi, N.; Jarrott, L. C.; Khan, S.; Kritcher, A. L.; Ma, T.; Macphee, A. G.; Landen, O.; Spears, B. K.; Springer, P. T.

2016-10-01

Measurements of the continuum x-ray spectrum emitted from the hot-spot of an ICF implosion can be used to infer a number thermodynamic properties at stagnation including temperature, pressure, and hot-spot mix. In deuterium-tritium (DT) layered implosion experiments on the National Ignition Facility (NIF) we field a number of x-ray diagnostics that provide spatial, temporal, and spectrally-resolved measurements of the radiated x-ray emission. We report on analysis of these measurements using a 1-D hot-spot model to infer thermodynamic properties at stagnation. We compare these to similar properties that can be derived from DT fusion neutron measurements. This work was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344.

Generation of first hard X-ray pulse at Tsinghua Thomson Scattering X-ray Source.

PubMed

Du, Yingchao; Yan, Lixin; Hua, Jianfei; Du, Qiang; Zhang, Zhen; Li, Renkai; Qian, Houjun; Huang, Wenhui; Chen, Huaibi; Tang, Chuanxiang

2013-05-01

Tsinghua Thomson Scattering X-ray Source (TTX) is the first-of-its-kind dedicated hard X-ray source in China based on the Thomson scattering between a terawatt ultrashort laser and relativistic electron beams. In this paper, we report the experimental generation and characterization of the first hard X-ray pulses (51.7 keV) via head-on collision of an 800 nm laser and 46.7 MeV electron beams. The measured yield is 1.0 × 10(6) per pulse with an electron bunch charge of 200 pC and laser pulse energy of 300 mJ. The angular intensity distribution and energy spectra of the X-ray pulse are measured with an electron-multiplying charge-coupled device using a CsI scintillator and silicon attenuators. These measurements agree well with theoretical and simulation predictions. An imaging test using the X-ray pulse at the TTX is also presented.

A cosmic and solar X-ray and gamma-ray instrument for a scout launch

NASA Technical Reports Server (NTRS)

Forrest, D. J.; Vestrand, W. T.; Chupp, E. L.

1988-01-01

An overview is presented for a set of simple and robust X-ray and gamma ray instruments which have both cosmic and solar objectives. The primary solar scientific objective is the study of the beaming of energetic electrons and ions in solar flares. The instrument will measure spectra and polarization of flare emissions up to 10 MeV. At X-ray energies both the directly emitted flux and the reflected albedo flux will be measured with a complement of six X-ray sensors. Each of these detectors will have a different high Z filter selected to optimize both the energy resolution and high rate capabilities in the energy band 10 to 300 keV. At energies greater than 100 keV seven 7.6 x 7.6 cm NaI and a set of 30 concentric plastic scattering detectors will record the spectra and polarization of electron bremsstrahlung and nuclear gamma rays. All of the components of the instrument are in existence and have passed flight tests for earlier space missions. The instrument will use a spinning solar oriented Scout spacecraft. The NaI detectors will act as a self-modulating gamma ray detector for cosmic sources in a broad angular band which lies at 90 degrees to the Sun-Earth vector and hence will scan the entire sky in 6 months.

Direct index of refraction measurements at extreme-ultraviolet and soft-x-ray wavelengths.

PubMed

Rosfjord, Kristine; Chang, Chang; Miyakawa, Ryan; Barth, Holly; Attwood, David

2006-03-10

Coherent radiation from undulator beamlines has been used to directly measure the real and imaginary parts of the index of refraction of several materials at both extreme-ultraviolet and soft-x-ray wavelengths. Using the XOR interferometer, we measure the refractive indices of silicon and ruthenium, essential materials for extreme-ultraviolet lithography. Both materials are tested at wavelength (13.4 nm) and across silicon's L2 (99.8 eV) and L3 (99.2 eV) absorption edges. We further extend this direct phase measurement method into the soft-x-ray region, where measurements of chromium and vanadium are performed around their L3 absorption edges at 574.1 and 512.1 eV, respectively. These are the first direct measurements, to our knowledge, of the real part of the index of refraction made in the soft-x-ray region.

Rainwater analysis by synchrotron radiation-total reflection X-ray fluorescence

NASA Astrophysics Data System (ADS)

López, María L.; Ceppi, Sergio A.; Asar, María L.; Bürgesser, Rodrigo E.; Ávila, Eldo E.

2015-11-01

Total reflection X-ray fluorescence analysis excited with synchrotron radiation was used to quantify the elemental concentration of rainwater in Córdoba, Argentina. Standard solutions with gallium as internal standard were prepared for the calibration curves. Rainwater samples of 5 μl were added to an acrylic reflector, allowed to dry, and analyzed for 200 s measuring time. The elemental concentrations of As, Ca, Co, Cr, Cu, Fe, K, Mn, Ni, Pb, S, Sr, V, and Zn were determined. The electrical conductivity, pH, and elemental concentrations were compared to data previously reported for the soluble fraction of rainwater at different sites. A factor analysis was performed in order to determine the sources that contributed to the elemental concentration in rainwater. Anthropogenic sources were identified as traffic pollution, vehicular emissions, and metallurgical factories. The quality of rainwater was analyzed by comparing the concentrations of all the elements in rainwater samples with the WHO guideline values for drinking water. The results show the need to control the atmospheric emissions in order to preserve the quality of rainwater. SR-TXRF analysis of chemical composition of rainwater in Córdoba represents the very first contribution in the region to the knowledge of the concentration of trace metals in the soluble fraction of rainwater. These data are scarce, especially in the Southern Hemisphere.

Boundary displacement measurements using multi-energy soft x-rays

DOE Office of Scientific and Technical Information (OSTI.GOV)

Tritz, K., E-mail: ktritz@pppl.gov; Stutman, D.; Diallo, A.

The Multi-Energy Soft X-ray (ME-SXR) system on NSTX provides radial profiles of soft X-ray emission, measured through a set of filters with varying thickness, which have been used to reconstruct the electron temperature on fast time scales (∼10 kHz). In addition to this functionality, here we show that the ME-SXR system can be used to measure the boundary displacement of the NSTX plasma with a few mm spatial resolution during magnetohydrodyamic (MHD) activity. Boundary displacement measurements can serve to inform theoretical predictions of neoclassical toroidal viscosity, and will be used to investigate other edge phenomena on NSTX-U. For example, boundary measurementsmore » using filtered SXR measurements can provide information on pedestal steepness and dynamic evolution leading up to and during edge localized modes (ELMs). Future applications include an assessment of a simplified, filtered SXR edge detection system as well as its suitability for real-time non-magnetic boundary feedback for ELMs, MHD, and equilibrium position control.« less

Damage threshold of coating materials on x-ray mirror for x-ray free electron laser

DOE Office of Scientific and Technical Information (OSTI.GOV)

Koyama, Takahisa, E-mail: koyama@spring8.or.jp; Yumoto, Hirokatsu; Tono, Kensuke

2016-05-15

We evaluated the damage threshold of coating materials such as Mo, Ru, Rh, W, and Pt on Si substrates, and that of uncoated Si substrate, for mirror optics of X-ray free electron lasers (XFELs). Focused 1 μm (full width at half maximum) XFEL pulses with the energies of 5.5 and 10 keV, generated by the SPring-8 angstrom compact free electron laser (SACLA), were irradiated under the grazing incidence condition. The damage thresholds were evaluated by in situ measurements of X-ray reflectivity degradation during irradiation by multiple pulses. The measured damage fluences below the critical angles were sufficiently high compared withmore » the unfocused SACLA beam fluence. Rh coating was adopted for two mirror systems of SACLA. One system was a beamline transport mirror system that was partially coated with Rh for optional utilization of a pink beam in the photon energy range of more than 20 keV. The other was an improved version of the 1 μm focusing mirror system, and no damage was observed after one year of operation.« less

Background-reducing X-ray multilayer mirror

DOEpatents

Bloch, Jeffrey J.; Roussel-Dupre', Diane; Smith, Barham W.

1992-01-01

Background-reducing x-ray multilayer mirror. A multiple-layer "wavetrap" deposited over the surface of a layered, synthetic-microstructure soft x-ray mirror optimized for reflectivity at chosen wavelengths is disclosed for reducing the reflectivity of undesired, longer wavelength incident radiation incident thereon. In three separate mirror designs employing an alternating molybdenum and silicon layered, mirrored structure overlaid by two layers of a molybdenum/silicon pair anti-reflection coating, reflectivities of near normal incidence 133, 171, and 186 .ANG. wavelengths have been optimized, while that at 304 .ANG. has been minimized. The optimization process involves the choice of materials, the composition of the layer/pairs as well as the number thereof, and the distance therebetween for the mirror, and the simultaneous choice of materials, the composition of the layer/pairs, and their number and distance for the "wavetrap."

Measurement of breast-tissue x-ray attenuation by spectral mammography: solid lesions

NASA Astrophysics Data System (ADS)

Fredenberg, Erik; Kilburn-Toppin, Fleur; Willsher, Paula; Moa, Elin; Danielsson, Mats; Dance, David R.; Young, Kenneth C.; Wallis, Matthew G.

2016-04-01

Knowledge of x-ray attenuation is essential for developing and evaluating x-ray imaging technologies. For instance, techniques to distinguish between cysts and solid tumours at mammography screening would be highly desirable to reduce recalls, but the development requires knowledge of the x-ray attenuation for cysts and tumours. We have previously measured the attenuation of cyst fluid using photon-counting spectral mammography. Data on x-ray attenuation for solid breast lesions are available in the literature, but cover a relatively wide range, likely caused by natural spread between samples, random measurement errors, and different experimental conditions. In this study, we have adapted a previously developed spectral method to measure the linear attenuation of solid breast lesions. A total of 56 malignant and 5 benign lesions were included in the study. The samples were placed in a holder that allowed for thickness measurement. Spectral (energy-resolved) images of the samples were acquired and the image signal was mapped to equivalent thicknesses of two known reference materials, which can be used to derive the x-ray attenuation as a function of energy. The spread in equivalent material thicknesses was relatively large between samples, which is likely to be caused mainly by natural variation and only to a minor extent by random measurement errors and sample inhomogeneity. No significant difference in attenuation was found between benign and malignant solid lesions. The separation between cyst-fluid and tumour attenuation was, however, significant, which suggests it may be possible to distinguish cystic from solid breast lesions, and the results lay the groundwork for a clinical trial. In addition, the study adds a relatively large sample set to the published data and may contribute to a reduction in the overall uncertainty in the literature.

3D measurements in conventional X-ray imaging with RGB-D sensors.

PubMed

Albiol, Francisco; Corbi, Alberto; Albiol, Alberto

2017-04-01

A method for deriving 3D internal information in conventional X-ray settings is presented. It is based on the combination of a pair of radiographs from a patient and it avoids the use of X-ray-opaque fiducials and external reference structures. To achieve this goal, we augment an ordinary X-ray device with a consumer RGB-D camera. The patient' s rotation around the craniocaudal axis is tracked relative to this camera thanks to the depth information provided and the application of a modern surface-mapping algorithm. The measured spatial information is then translated to the reference frame of the X-ray imaging system. By using the intrinsic parameters of the diagnostic equipment, epipolar geometry, and X-ray images of the patient at different angles, 3D internal positions can be obtained. Both the RGB-D and X-ray instruments are first geometrically calibrated to find their joint spatial transformation. The proposed method is applied to three rotating phantoms. The first two consist of an anthropomorphic head and a torso, which are filled with spherical lead bearings at precise locations. The third one is made of simple foam and has metal needles of several known lengths embedded in it. The results show that it is possible to resolve anatomical positions and lengths with a millimetric level of precision. With the proposed approach, internal 3D reconstructed coordinates and distances can be provided to the physician. It also contributes to reducing the invasiveness of ordinary X-ray environments and can replace other types of clinical explorations that are mainly aimed at measuring or geometrically relating elements that are present inside the patient's body. Copyright © 2017 IPEM. Published by Elsevier Ltd. All rights reserved.

X-ray Observations of Cosmic Ray Acceleration

NASA Technical Reports Server (NTRS)

Petre, Robert

2012-01-01

Since the discovery of cosmic rays, detection of their sources has remained elusive. A major breakthrough has come through the identification of synchrotron X-rays from the shocks of supernova remnants through imaging and spectroscopic observations by the most recent generation of X-ray observatories. This radiation is most likely produced by electrons accelerated to relativistic energy, and thus has offered the first, albeit indirect, observational evidence that diffusive shock acceleration in supernova remnants produces cosmic rays to TeV energies, possibly as high as the "knee" in the cosmic ray spectrum. X-ray observations have provided information about the maximum energy to which these shOCks accelerate electrons, as well as indirect evidence of proton acceleration. Shock morphologies measured in X-rays have indicated that a substantial fraction of the shock energy can be diverted into particle acceleration. This presentation will summarize what we have learned about cosmic ray acceleration from X-ray observations of supernova remnants over the past two decades.

Total reflection X-ray Fluorescence determination of interfering elements rubidium and uranium by profile fitting

NASA Astrophysics Data System (ADS)

Dhara, Sangita; Khooha, Ajay; Singh, Ajit Kumar; Tiwari, M. K.; Misra, N. L.

2018-06-01

Systematic studies to assess the analytical parameters obtained in the total reflection X-ray fluorescence (TXRF) determinations of interfering elements Rb and U using profile fitting are reported in the present manuscript. The X-ray lines Rb Kα and U Lα having serious spectral interference (ΔE = 218 eV), have been used as analytical lines. The intensities of these X-ray lines have been assessed using profile fitting. In order to compare the analytical results of Rb determinations in presence of U, with and without U excitation, synchrotron radiation was tuned to energy just above and below the U Labs edge. This approach shall excite both Rb Kα and U Lα simultaneously and Rb Kα selectively. Finally, the samples were also analyzed with a laboratory based TXRF spectrometer. The analytical results obtained in all these conditions were comparable. The authenticity of the results was assessed by analyzing U with respect to Rb in Rb2U(SO4)3, a standard reference material for U. The average precision obtained for TXRF determinations was below 3% (RSD, n = 3, 1σ) and the percent deviation of TXRF values from the expected values calculated on the basis of sample preparation was within 3%.

Determination of layer ordering using sliding-window Fourier transform of x-ray reflectivity data

NASA Astrophysics Data System (ADS)

Smigiel, E.; Knoll, A.; Broll, N.; Cornet, A.

1998-01-01

X-ray reflectometry allows the determination of the thickness, density and roughness of thin layers on a substrate from several Angstroms to some hundred nanometres. The thickness is determined by simulation with trial-and-error methods after extracting initial values of the layer thicknesses from the result of a classical Fast Fourier Transform (FFT) of the reflectivity data. However, the order information of the layers is lost during classical FFT. The order of the layers has then to be known a priori. In this paper, it will be shown that the order of the layers can be obtained by a sliding-window Fourier transform, the so-called Gabor representation. This joint time-frequency analysis allows the direct determination of the order of the layers and, therefore, the use of a more appropriate starting model for refining simulations. A simulated and a measured example show the interest of this method.

Magnetic x-ray scattering studies of holmium using synchro- tron radiation

DOE Office of Scientific and Technical Information (OSTI.GOV)

Gibbs, D.; Moncton, D.E.; D'Amico, K.L.

1985-07-08

We present the results of magnetic x-ray scattering experiments on the rare-earth metal holmium using synchrotron radiation. Direct high-resolution measurements of the nominally incommensurate magnetic satellite reflections reveal new lock-in behavior which we explain within a simple spin-discommensuration model. As a result of magnetoelastic coupling, the spin-discommensuration array produces additional x-ray diffraction satellites. Their observation further substantiates the model and demonstrates additional advantages of synchrotron radiation for magnetic-structure studies.

Impulsive solar X-ray bursts. III - Polarization, directivity, and spectrum of the reflected and total bremsstrahlung radiation from a beam of electrons directed toward the photosphere

NASA Technical Reports Server (NTRS)

Langer, S. H.; Petrosian, V.

1977-01-01

The paper presents the spectrum, directivity, and state of polarization of the bremsstrahlung radiation expected from a beam of high-energy electrons spiraling along radial magnetic field lines toward the photosphere. A Monte Carlo method is then described for evaluation of the spectrum, directivity, and polarization of X-rays diffusely reflected from stellar photospheres. The accuracy of the technique is evaluated through comparison with analytic results. The calculated characteristics of the incident X-rays are used to evaluate the spectrum, directivity, and polarization of the reflected and total X-ray fluxes. The results are compared with observations.

Diffraction based method to reconstruct the spectrum of the Thomson scattering x-ray source

NASA Astrophysics Data System (ADS)

Chi, Zhijun; Yan, Lixin; Zhang, Zhen; Zhou, Zheng; Zheng, Lianmin; Wang, Dong; Tian, Qili; Wang, Wei; Nie, Zan; Zhang, Jie; Du, Yingchao; Hua, Jianfei; Shi, Jiaru; Pai, Chihao; Lu, Wei; Huang, Wenhui; Chen, Huaibi; Tang, Chuanxiang

2017-04-01

As Thomson scattering x-ray sources based on the collision of intense laser and relativistic electrons have drawn much attention in various scientific fields, there is an increasing demand for the effective methods to reconstruct the spectrum information of the ultra-short and high-intensity x-ray pulses. In this paper, a precise spectrum measurement method for the Thomson scattering x-ray sources was proposed with the diffraction of a Highly Oriented Pyrolytic Graphite (HOPG) crystal and was demonstrated at the Tsinghua Thomson scattering X-ray source. The x-ray pulse is diffracted by a 15 mm (L) ×15 mm (H)× 1 mm (D) HOPG crystal with 1° mosaic spread. By analyzing the diffraction pattern, both x-ray peak energies and energy spectral bandwidths at different polar angles can be reconstructed, which agree well with the theoretical value and simulation. The higher integral reflectivity of the HOPG crystal makes this method possible for single-shot measurement.

Diffraction based method to reconstruct the spectrum of the Thomson scattering x-ray source.

PubMed

Chi, Zhijun; Yan, Lixin; Zhang, Zhen; Zhou, Zheng; Zheng, Lianmin; Wang, Dong; Tian, Qili; Wang, Wei; Nie, Zan; Zhang, Jie; Du, Yingchao; Hua, Jianfei; Shi, Jiaru; Pai, Chihao; Lu, Wei; Huang, Wenhui; Chen, Huaibi; Tang, Chuanxiang

2017-04-01

As Thomson scattering x-ray sources based on the collision of intense laser and relativistic electrons have drawn much attention in various scientific fields, there is an increasing demand for the effective methods to reconstruct the spectrum information of the ultra-short and high-intensity x-ray pulses. In this paper, a precise spectrum measurement method for the Thomson scattering x-ray sources was proposed with the diffraction of a Highly Oriented Pyrolytic Graphite (HOPG) crystal and was demonstrated at the Tsinghua Thomson scattering X-ray source. The x-ray pulse is diffracted by a 15 mm (L) ×15 mm (H)× 1 mm (D) HOPG crystal with 1° mosaic spread. By analyzing the diffraction pattern, both x-ray peak energies and energy spectral bandwidths at different polar angles can be reconstructed, which agree well with the theoretical value and simulation. The higher integral reflectivity of the HOPG crystal makes this method possible for single-shot measurement.

Application of MEMS-based x-ray optics as tuneable nanosecond choppers

NASA Astrophysics Data System (ADS)

Chen, Pice; Walko, Donald A.; Jung, Il Woong; Li, Zhilong; Gao, Ya; Shenoy, Gopal K.; Lopez, Daniel; Wang, Jin

2017-08-01

Time-resolved synchrotron x-ray measurements often rely on using a mechanical chopper to isolate a set of x-ray pulses. We have started the development of micro electromechanical systems (MEMS)-based x-ray optics, as an alternate method to manipulate x-ray beams. In the application of x-ray pulse isolation, we recently achieved a pulse-picking time window of half a nanosecond, which is more than 100 times faster than mechanical choppers can achieve. The MEMS device consists of a comb-drive silicon micromirror, designed for efficiently diffracting an x-ray beam during oscillation. The MEMS devices were operated in Bragg geometry and their oscillation was synchronized to x-ray pulses, with a frequency matching subharmonics of the cycling frequency of x-ray pulses. The microscale structure of the silicon mirror in terms of the curvature and the quality of crystallinity ensures a narrow angular spread of the Bragg reflection. With the discussion of factors determining the diffractive time window, this report showed our approaches to narrow down the time window to half a nanosecond. The short diffractive time window will allow us to select single x-ray pulse out of a train of pulses from synchrotron radiation facilities.

Research of X-ray curved crystals analyzer

NASA Astrophysics Data System (ADS)

Xiao, Shali; Xong, Xian-cai; Qian, Jia-yu; Zhong, Xian-xin; Yan, Guo-hong; Liu, Zhong-li; Ding, Yong-kun

2005-08-01

X-ray spectrograph has long been used as a means of diagnosing conditions of laser-produced plasmas, as information concerning both the temperature and density can be extracted from the emitted radiation. For the measurement of X-ray lines in the energy range of 0.6-6 keV, A curved crystal X-ray spectrometer of reflection type elliptical geometry is required. In order to obtain both high resolution and collection efficiency the elliptical geometry is more advantageous than the flat configurations. Elliptical curved crystals spectrograph with a relatively wide spectral range are of particular use for deducing electron temperatures by measurement of the ratios of lines associated with different charge states. Curved crystals analyzer was designed and manufactured for use on an experiment to investigate the properties of laser produced plasmas. The spectrograph has 1350mm focal length and for these measurements, utilized PET, LIF, KAP and MICA crystal bent onto an elliptical substrate. This crystal analyzer covers the Bragg angel range from 30 to 67.5. The analyzer based on elliptically geometrical principle, which has self-focusing characteristics. The experiment was carried out on Shanghai Shengguang-II Facility and aimed to investigate the characteristics of a high density plasma. Experimental results using Curved crystal analyzer are described which show spectrum of Ti, Au laser-plasma. The focusing crystal analyzer clearly gave an increase in sensitivity over a flat crystal. Spectra showing the main resonance line were recorded with X-ray CCD and with laser energies 150J laser wavelength 350nm. The calculated wavelength resolution is about 500-1000.

A first evaluation of the analytical capabilities of the new X-ray fluorescence facility at International Atomic Energy Agency-Elettra Sincrotrone Trieste for multipurpose total reflection X-ray fluorescence analysis

NASA Astrophysics Data System (ADS)

Marguí, Eva; Hidalgo, Manuela; Migliori, Alessandro; Leani, Juan José; Queralt, Ignasi; Kallithrakas-Kontos, Nikolaos; Streli, Christina; Prost, Josef; Karydas, Andreas Germanos

2018-07-01

The aim of the work is to present a systematic evaluation of the analytical capabilities of the new X-ray fluorescence facility jointly operated between the International Atomic Energy Agency and the Elettra Sincrotrone Trieste for multipurpose total reflection X-ray fluorescence analysis. The analytical performance of the XRF beamline end-station (IAEAXspe) was systematically evaluated under TXRF excitation geometry by analyzing different types of aqueous (lake, waste and fresh water) and solid (soil, vegetal, biological) certified reference materials using an excitation energy of 13.0 keV (for the purpose of multielemental analysis). The results obtained for both types of samples in terms of limits of detection and accuracy were also compared with those obtained using laboratory X-ray tube based TXRF systems with different features (including Mo and W X-ray tube systems). Taking advantage of the possibility to work under high vacuum, the IAEAXspe set-up instrumental sensitivity was also determined using an excitation energy of 6.2 keV to explore the possibilities for light elements determination. A clear improvement of the element detection limits is achieved when comparing this facility to conventional X-ray tube based TXRF systems highlighting the benefits of using the monoenergetic synchrotron exciting radiation and the ultra-high vacuum chamber in comparison with conventional laboratory systems. The results of the present work are discussed in view of further exploitation of the facility for different environmental and biological related applications.

Rb + adsorption at the quartz(101)-aqueous interface: comparison of resonant anomalous x-ray reflectivity with ab initio calculations

DOE PAGES

Bellucci, Francesco; Lee, Sang Soo; Kubicki, James D.; ...

2015-01-29

We study adsorption of Rb + to the quartz(101)–aqueous interface at room temperature with specular X-ray reflectivity, resonant anomalous X-ray reflectivity, and density functional theory. The interfacial water structures observed in deionized water and 10 mM RbCl solution at pH 9.8 were similar, having a first water layer at height of 1.7 ± 0.1 Å above the quartz surface and a second layer at 4.8 ± 0.1 Å and 3.9 ± 0.8 Å for the water and RbCl solutions, respectively. The adsorbed Rb + distribution is broad and consists of presumed inner-sphere (IS) and outer-sphere (OS) complexes at heights ofmore » 1.8 ± 0.1 and 6.4 ± 1.0 Å, respectively. Projector-augmented planewave density functional theory (DFT) calculations of potential configurations for neutral and negatively charged quartz(101) surfaces at pH 7 and 12, respectively, reveal a water structure in agreement with experimental results. These DFT calculations also show differences in adsorbed speciation of Rb + between these two conditions. At pH 7, the lowest energy structure shows that Rb + adsorbs dominantly as an IS complex, whereas at pH 12 IS and OS complexes have equivalent energies. The DFT results at pH 12 are generally consistent with the two site Rb distribution observed from the X-ray data at pH 9.8, albeit with some differences that are discussed. In conclusion, surface charge estimated on the basis of the measured total Rb + coverage was -0.11 C/m 2, in good agreement with the range of the surface charge magnitudes reported in the literature.« less

X-Ray Absorbed, Broad-Lined, Red AGN and the Cosmic X-Ray Background

NASA Technical Reports Server (NTRS)

Mushotzky, Richard (Technical Monitor); Wilkes, Belinda

2005-01-01

We have obtained XMM spectra for five red, 2MASS AGN, selected from a sample observed by Chandra to be X-ray bright and to cover a range of hardness ratios. Our results confirm the presence of substantial absorbing material in three sources which have optical classifications ranging from Type 1 to Type 2, with an intrinsically flat (hard) power law continuum indicated in the other two. The presence of both X-ray absorption and broad optical emission lines with the usual strength suggests either a small (nuclear) absorber or a favored viewing angle so as to cover the X-ray source but not the broad emission line region (BELR). A soft excess is detected in all three Type 1 sources. We speculate that this soft X-ray emission may arise in an extended region of ionized gas, perhaps linked with the polarized (scattered) light which is a feature of these sources. The spectral complexity revealed by XMM emphasizes the limitations of the low S/N Chandra data. Overall, the new XMM results strengthen our conclusions (Wilkes et al. 2002) that the observed X-ray continua of red AGN are unusually hard at energies greater than 2 keV. Whether due to substantial line-of-sight absorption or to an intrinsically hard or reflection-dominated spectrum, these 'red' AGN have an observed spectral form consistent with contributing significantly to the missing had absorbed population of the Cosmic X-ray Background (CXRB). When absorption and or reflection is taken into account, all these AGN have power law slopes typical of broad-line (Type 1) AGN (Gamma approximately 1.9). This appears to resolve the spectral paradox which for so long has existed between the CXRB and the AGN thought to be the dominant contributors. It also suggests two scenarios whereby Type 1 AGN/QSOs may be responsible for a significant fraction of the CXRB at energies above 2 keV: 1) X-ray absorbed AGN/QSOs with visible broad emission lines; 2) AGN/QSOs with complex spectra whose hardness greater than 2 keV is not

PREFACE: Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniques Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniques

NASA Astrophysics Data System (ADS)

Sakurai, Kenji

2010-12-01

measurement. Advances in such technologies are bringing with them new opportunities in surface and buried interface science. In the not too distant future, we will publish a special issue or a book detailing such progress. Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniques contents Lateral uniformity in chemical composition along a buried reaction front in polymers using off-specular reflectivity Kristopher A Lavery, Vivek M Prabhu, Sushil Satija and Wen-li Wu Orientation dependence of Pd growth on Au electrode surfaces M Takahasi, K Tamura, J Mizuki, T Kondo and K Uosaki A grazing incidence small-angle x-ray scattering analysis on capped Ge nanodots in layer structures Hiroshi Okuda, Masayuki Kato, Keiji Kuno, Shojiro Ochiai, Noritaka Usami, Kazuo Nakajima and Osami Sakata High resolution grazing-incidence in-plane x-ray diffraction for measuring the strain of a Si thin layer Kazuhiko Omote X-ray analysis of mesoporous silica thin films templated by Brij58 surfactant S Fall, M Kulij and A Gibaud Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structures Kouichi Hayashi Epitaxial growth of largely mismatched crystals on H-terminated Si(111) surfaces Hidehito Asaoka Novel TiO2/ZnO multilayer mirrors at 'water-window' wavelengths fabricated by atomic layer epitaxy H Kumagai, Y Tanaka, M Murata, Y Masuda and T Shinagawa Depth-selective structural analysis of thin films using total-external-reflection x-ray diffraction Tomoaki Kawamura and Hiroo Omi Structures of Yb nanoparticle thin films grown by deposition in He and N2 gas atmospheres: AFM and x-ray reflectivity studies Martin Jerab and Kenji Sakurai Ga and As composition profiles in InP/GaInAs/InP heterostructures—x-ray CTR scattering and cross-sectional STM measurements Yoshikazu Takeda, Masao Tabuchi and Arao Nakamura Polarized neutron reflectivity study of a thermally treated MnIr/CoFe exchange bias system Naoki

Detection of Reflection Features in the Neutron Star Low-mass X-Ray Binary Serpens X-1 with NICER

NASA Astrophysics Data System (ADS)

Ludlam, R. M.; Miller, J. M.; Arzoumanian, Z.; Bult, P. M.; Cackett, E. M.; Chakrabarty, D.; Dauser, T.; Enoto, T.; Fabian, A. C.; García, J. A.; Gendreau, K. C.; Guillot, S.; Homan, J.; Jaisawal, G. K.; Keek, L.; La Marr, B.; Malacaria, C.; Markwardt, C. B.; Steiner, J. F.; Strohmayer, T. E.

2018-05-01

We present Neutron Star Interior Composition Explorer (NICER) observations of the neutron star (NS) low-mass X-ray binary Serpens X-1 during the early mission phase in 2017. With the high spectral sensitivity and low-energy X-ray passband of NICER, we are able to detect the Fe L line complex in addition to the signature broad, asymmetric Fe K line. We confirm the presence of these lines by comparing the NICER data to archival observations with XMM-Newton/Reflection Grating Spectrometer (RGS) and NuSTAR. Both features originate close to the innermost stable circular orbit (ISCO). When modeling the lines with the relativistic line model RELLINE, we find that the Fe L blend requires an inner disk radius of {1.4}-0.1+0.2 R ISCO and Fe K is at {1.03}-0.03+0.13 R ISCO (errors quoted at 90%). This corresponds to a position of {17.3}-1.2+2.5 km and {12.7}-0.4+1.6 km for a canonical NS mass ({M}NS}=1.4 {M}ȯ ) and dimensionless spin value of a = 0. Additionally, we employ a new version of the RELXILL model tailored for NSs and determine that these features arise from a dense disk and supersolar Fe abundance.

Soft x-ray reduction camera for submicron lithography

DOEpatents

Hawryluk, Andrew M.; Seppala, Lynn G.

1991-01-01

Soft x-ray projection lithography can be performed using x-ray optical components and spherical imaging lenses (mirrors), which form an x-ray reduction camera. The x-ray reduction is capable of projecting a 5x demagnified image of a mask onto a resist coated wafer using 4.5 nm radiation. The diffraction limited resolution of this design is about 135 nm with a depth of field of about 2.8 microns and a field of view of 0.2 cm.sup.2. X-ray reflecting masks (patterned x-ray multilayer mirrors) which are fabricated on thick substrates and can be made relatively distortion free are used, with a laser produced plasma for the source. Higher resolution and/or larger areas are possible by varying the optic figures of the components and source characteristics.

Apollo 15 X-ray fluorescence experiment

NASA Technical Reports Server (NTRS)

Adler, I.; Trombka, J.; Gerard, J.; Schmadebeck, R.; Lowman, P.; Blodgett, H.; Yin, L.; Eller, E.; Lamothe, R.; Gorenstein, P.

1971-01-01

The X-ray fluorescence spectrometer, carried in the SIM bay of the command service module was employed principally for compositional mapping of the lunar surface while in lunar orbit, and secondarily, for X-ray astronomical observations during the trans-earth coast. The lunar surface measurements involved observations of the intensity and characteristics energy distribution of the secondary or fluorescent X-rays produced by the interaction of solar X-rays with the lunar surface. The astronomical observations consisted of relatively long periods of measurements of X-rays from pre-selected galactic sources such as Cyg-X-1 and Sco X-1 as well as from the galactic poles.

Simulation tools for analyzer-based x-ray phase contrast imaging system with a conventional x-ray source

NASA Astrophysics Data System (ADS)

Caudevilla, Oriol; Zhou, Wei; Stoupin, Stanislav; Verman, Boris; Brankov, J. G.

2016-09-01

Analyzer-based X-ray phase contrast imaging (ABI) belongs to a broader family of phase-contrast (PC) X-ray imaging modalities. Unlike the conventional X-ray radiography, which measures only X-ray absorption, in PC imaging one can also measures the X-rays deflection induced by the object refractive properties. It has been shown that refraction imaging provides better contrast when imaging the soft tissue, which is of great interest in medical imaging applications. In this paper, we introduce a simulation tool specifically designed to simulate the analyzer-based X-ray phase contrast imaging system with a conventional polychromatic X-ray source. By utilizing ray tracing and basic physical principles of diffraction theory our simulation tool can predicting the X-ray beam profile shape, the energy content, the total throughput (photon count) at the detector. In addition we can evaluate imaging system point-spread function for various system configurations.

Single-pulse x-ray diffraction using polycapillary optics for in situ dynamic diffraction

DOE Office of Scientific and Technical Information (OSTI.GOV)

Maddox, B. R., E-mail: maddox3@llnl.gov; Akin, M. C., E-mail: akin1@llnl.gov; Teruya, A.

2016-08-15

Diagnostic use of single-pulse x-ray diffraction (XRD) at pulsed power facilities can be challenging due to factors such as the high flux and brightness requirements for diffraction and the geometric constraints of experimental platforms. By necessity, the x-ray source is usually positioned very close, within a few inches of the sample. On dynamic compression platforms, this puts the x-ray source in the debris field. We coupled x-ray polycapillary optics to a single-shot needle-and-washer x-ray diode source using a laser-based alignment scheme to obtain high-quality x-ray diffraction using a single 16 ns x-ray pulse with the source >1 m from themore » sample. The system was tested on a Mo sample in reflection geometry using 17 keV x-rays from a Mo anode. We also identified an anode conditioning effect that increased the x-ray intensity by 180%. Quantitative measurements of the x-ray focal spot produced by the polycapillary yielded a total x-ray flux on the sample of 3.3 ± 0.5 × 10{sup 7} molybdenum Kα photons.« less

Monitoring X-Ray Emission from X-Ray Bursters

NASA Technical Reports Server (NTRS)

Halpern, Jules P.; Kaaret, Philip

1999-01-01

The scientific goal of this project was to monitor a selected sample of x-ray bursters using data from the All-Sky Monitor (ASM) on the Rossi X-Ray Timing Explorer together with data from the Burst and Transient Source Experiment (BATSE) on the Compton Gamma-Ray Observatory to study the long-term temporal evolution of these sources in the x-ray and hard x-ray bands. The project was closely related to "Long-Term Hard X-Ray Monitoring of X-Ray Bursters", NASA project NAG5-3891, and and "Hard x-ray emission of x-ray bursters", NASA project NAG5-4633, and shares publications in common with both of these. The project involved preparation of software for use in monitoring and then the actual monitoring itself. These efforts have lead to results directly from the ASM data and also from Target of Opportunity Observations (TOO) made with the Rossi X-Ray Timing Explorer based on detection of transient hard x-ray outbursts with the ASM and BATSE.

Alignment of x-ray tube focal spots for spectral measurement.

PubMed

Nishizawa, K; Maekoshi, H; Kamiya, Y; Kobayashi, Y; Ohara, K; Sakuma, S

1982-01-01

A general method to align a diagnostic x-ray machine for x-ray spectrum measurement purpose was theoretically and experimentally investigated by means of the optical alignment of focal pinhole images. Focal pinhole images were obtained by using a multi-pinholed lead plate. the vertical plane, including the central axis and tube axis, was decided upon by observing the symmetry of focal images. the central axis was designated as a line through the center of focus parallel to the target surface lying in the vertical plane. A method to determine the manipulation of the central axis in any direction is presented.

Measurement of X-ray emission efficiency for K-lines.

PubMed

Procop, M

2004-08-01

Results for the X-ray emission efficiency (counts per C per sr) of K-lines for selected elements (C, Al, Si, Ti, Cu, Ge) and for the first time also for compounds and alloys (SiC, GaP, AlCu, TiAlC) are presented. An energy dispersive X-ray spectrometer (EDS) of known detection efficiency (counts per photon) has been used to record the spectra at a takeoff angle of 25 degrees determined by the geometry of the secondary electron microscope's specimen chamber. Overall uncertainty in measurement could be reduced to 5 to 10% in dependence on the line intensity and energy. Measured emission efficiencies have been compared with calculated efficiencies based on models applied in standardless analysis. The widespread XPP and PROZA models give somewhat too low emission efficiencies. The best agreement between measured and calculated efficiencies could be achieved by replacing in the modular PROZA96 model the original expression for the ionization cross section by the formula given by Casnati et al. (1982) A discrepancy remains for carbon, probably due to the high overvoltage ratio.

X-Pinch And Its Applications In X-ray Radiograph

DOE Office of Scientific and Technical Information (OSTI.GOV)

Zou Xiaobing; Wang Xinxin; Liu Rui

2009-07-07

An X-pinch device and the related diagnostics of x-ray emission from X-pinch were briefly described. The time-resolved x-ray measurements with photoconducting diodes show that the x-ray pulse usually consists of two subnanosecond peaks with a time interval of about 0.5 ns. Being consistent with these two peaks of the x-ray pulse, two point x-ray sources of size ranging from 100 mum to 5 mum and depending on cut-off x-ray photon energy were usually observed on the pinhole pictures. The x-pinch was used as x-ray source for backlighting of the electrical explosion of single wire and the evolution of X-pinch, andmore » for phase-contrast imaging of soft biological objects such as a small shrimp and a mosquito.« less

Absolute Hugoniot measurements from a spherically convergent shock using x-ray radiography

NASA Astrophysics Data System (ADS)

Swift, Damian C.; Kritcher, Andrea L.; Hawreliak, James A.; Lazicki, Amy; MacPhee, Andrew; Bachmann, Benjamin; Döppner, Tilo; Nilsen, Joseph; Collins, Gilbert W.; Glenzer, Siegfried; Rothman, Stephen D.; Kraus, Dominik; Falcone, Roger W.

2018-05-01

The canonical high pressure equation of state measurement is to induce a shock wave in the sample material and measure two mechanical properties of the shocked material or shock wave. For accurate measurements, the experiment is normally designed to generate a planar shock which is as steady as possible in space and time, and a single state is measured. A converging shock strengthens as it propagates, so a range of shock pressures is induced in a single experiment. However, equation of state measurements must then account for spatial and temporal gradients. We have used x-ray radiography of spherically converging shocks to determine states along the shock Hugoniot. The radius-time history of the shock, and thus its speed, was measured by radiographing the position of the shock front as a function of time using an x-ray streak camera. The density profile of the shock was then inferred from the x-ray transmission at each instant of time. Simultaneous measurement of the density at the shock front and the shock speed determines an absolute mechanical Hugoniot state. The density profile was reconstructed using the known, unshocked density which strongly constrains the density jump at the shock front. The radiographic configuration and streak camera behavior were treated in detail to reduce systematic errors. Measurements were performed on the Omega and National Ignition Facility lasers, using a hohlraum to induce a spatially uniform drive over the outside of a solid, spherical sample and a laser-heated thermal plasma as an x-ray source for radiography. Absolute shock Hugoniot measurements were demonstrated for carbon-containing samples of different composition and initial density, up to temperatures at which K-shell ionization reduced the opacity behind the shock. Here we present the experimental method using measurements of polystyrene as an example.

Estimation of effective x-ray tissue attenuation differences for volumetric breast density measurement

NASA Astrophysics Data System (ADS)

Chen, Biao; Ruth, Chris; Jing, Zhenxue; Ren, Baorui; Smith, Andrew; Kshirsagar, Ashwini

2014-03-01

Breast density has been identified to be a risk factor of developing breast cancer and an indicator of lesion diagnostic obstruction due to masking effect. Volumetric density measurement evaluates fibro-glandular volume, breast volume, and breast volume density measures that have potential advantages over area density measurement in risk assessment. One class of volume density computing methods is based on the finding of the relative fibro-glandular tissue attenuation with regards to the reference fat tissue, and the estimation of the effective x-ray tissue attenuation differences between the fibro-glandular and fat tissue is key to volumetric breast density computing. We have modeled the effective attenuation difference as a function of actual x-ray skin entrance spectrum, breast thickness, fibro-glandular tissue thickness distribution, and detector efficiency. Compared to other approaches, our method has threefold advantages: (1) avoids the system calibration-based creation of effective attenuation differences which may introduce tedious calibrations for each imaging system and may not reflect the spectrum change and scatter induced overestimation or underestimation of breast density; (2) obtains the system specific separate and differential attenuation values of fibroglandular and fat for each mammographic image; and (3) further reduces the impact of breast thickness accuracy to volumetric breast density. A quantitative breast volume phantom with a set of equivalent fibro-glandular thicknesses has been used to evaluate the volume breast density measurement with the proposed method. The experimental results have shown that the method has significantly improved the accuracy of estimating breast density.

Stellar X-Ray Polarimetry

NASA Technical Reports Server (NTRS)

Swank, J.

2011-01-01

Most of the stellar end-state black holes, pulsars, and white dwarfs that are X-ray sources should have polarized X-ray fluxes. The degree will depend on the relative contributions of the unresolved structures. Fluxes from accretion disks and accretion disk corona may be polarized by scattering. Beams and jets may have contributions of polarized emission in strong magnetic fields. The Gravity and Extreme Magnetism Small Explorer (GEMS) will study the effects on polarization of strong gravity of black holes and strong magnetism of neutron stars. Some part of the flux from compact stars accreting from companion stars has been reflected from the companion, its wind, or accretion streams. Polarization of this component is a potential tool for studying the structure of the gas in these binary systems. Polarization due to scattering can also be present in X-ray emission from white dwarf binaries and binary normal stars such as RS CVn stars and colliding wind sources like Eta Car. Normal late type stars may have polarized flux from coronal flares. But X-ray polarization sensitivity is not at the level needed for single early type stars.

Novel X-ray Communication Based XNAV Augmentation Method Using X-ray Detectors

PubMed Central

Song, Shibin; Xu, Luping; Zhang, Hua; Bai, Yuanjie

2015-01-01

The further development of X-ray pulsar-based NAVigation (XNAV) is hindered by its lack of accuracy, so accuracy improvement has become a critical issue for XNAV. In this paper, an XNAV augmentation method which utilizes both pulsar observation and X-ray ranging observation for navigation filtering is proposed to deal with this issue. As a newly emerged concept, X-ray communication (XCOM) shows great potential in space exploration. X-ray ranging, derived from XCOM, could achieve high accuracy in range measurement, which could provide accurate information for XNAV. For the proposed method, the measurement models of pulsar observation and range measurement observation are established, and a Kalman filtering algorithm based on the observations and orbit dynamics is proposed to estimate the position and velocity of a spacecraft. A performance comparison of the proposed method with the traditional pulsar observation method is conducted by numerical experiments. Besides, the parameters that influence the performance of the proposed method, such as the pulsar observation time, the SNR of the ranging signal, etc., are analyzed and evaluated by numerical experiments. PMID:26404295

Wettability measurement under high P-T conditions using X-ray imaging with application to the brine-supercritical CO 2 system: WETTABILITY MEASUREMENT USING X-RAY

DOE Office of Scientific and Technical Information (OSTI.GOV)

Chaudhary, Kuldeep; Guiltinan, Eric J.; Cardenas, M. Bayani

2015-08-30

We present a new method for measuring wettability or contact angle of minerals at reservoir pressure-temperature conditions using high-resolution X-ray computed tomography (HRXCT) and radiography. In this method, a capillary or a narrow slot is constructed from a mineral or a rock sample of interest wherein two fluids are allowed to form an interface that is imaged using X-rays. After some validation measurements at room pressure-temperature conditions, we illustrate this method by measuring the contact angle of CO 2-brine on quartz, muscovite, shale, borosilicate glass, polytetrafluoroethylene (PTFE or Teflon), and polyether ether ketone (PEEK) surfaces at 60–71°C and 13.8–22.8 MPa.more » At reservoir conditions, PTFE and PEEK surfaces were found to be CO 2-wet with contact angles of 140° and 127°, respectively. Quartz and muscovite were found to be water-wet with contact angles of 26° and 58°, respectively, under similar conditions. Borosilicate glass-air-brine at room conditions showed strong water-wet characteristics with a contact angle of 9°, whereas borosilicate glass-CO 2-brine at 13.8 MPa and 60°C showed a decrease in its water-wetness with contact angle of 54°. This method provides a new application for X-ray imaging and an alternative to other methods.« less

X-ray comb generation from nuclear-resonance-stabilized x-ray free-electron laser oscillator for fundamental physics and precision metrology

DOE PAGES

Adams, B.  W.; Kim, K. -J.

2015-03-31

An x-ray free-electron laser oscillator (XFELO) is a next-generation x-ray source, similar to free-electron laser oscillators at VUV and longer wavelengths but using crystals as high-reflectivity x-ray mirrors. Each output pulse from an XFELO is fully coherent with high spectral purity. The temporal coherence length can further be increased drastically, from picoseconds to microseconds or even longer, by phase-locking successive XFELO output pulses, using the narrow nuclear resonance lines of nuclei such as ⁵⁷Fe as a reference. We show that the phase fluctuation due to the seismic activities is controllable and that due to spontaneous emission is small. The fluctuationmore » of electron-bunch spacing contributes mainly to the envelope fluctuation but not to the phase fluctuation. By counting the number of standing-wave maxima formed by the output of the nuclear-resonance-stabilized (NRS) XFELO over an optically known length, the wavelength of the nuclear resonance can be accurately measured, possibly leading to a new length or frequency standard at x-ray wavelengths. A NRS-XFELO will be an ideal source for experimental x-ray quantum optics as well as other fundamental physics. The technique can be refined for other, narrower resonances such as ¹⁸¹Ta or ⁴⁵Sc.« less

Exploring Cosmic X-ray Source Polarization

NASA Technical Reports Server (NTRS)

Swank, Jean Hebb; Jahodal, K.; Kallman, T. R.; Kaaret, P.

2008-01-01

Cosmic X-ray sources are expected to be polarized, either because of their asymmetry and the role of scattering in their emission or the role of magnetic fields. Polarization at other wavelengths has been useful. X-ray polarization will provide a new handle on black hole parameters, in particular the spin, on accretion flows and outflows, on neutron star spin orientations and emission mechanisms, on the quantum mechanical effects of super-strong magnetic fields of magnetars, and on the structure of supernovae shocks. The proposed Gravity and Extreme Magnetism SMEX (GEMS) will use high efficiency polarimeters behind thin foil mirrors. The statistical sensitivity and control of systematics will allow measurement of polarization fractions as small as 1% from many galactic and extragalactic sources. Targets which should be polarized at the level that GEMS can easily measure include stellar black holes, Seyfert galaxies and quasars, blazars, rotation-powered and accretion-powered pulsars, magnetars, shell supernova remnants and pulsar wind nebulae. The polarimeters are Time Projection Chambers that allow reconstruction of images of photoelectron tracks for 2-10 keV Xrays. They can be deep without sacrificing modulation. These polarimeters do not image the sky, but the telescope point spread function and detector collimation allow structure to be resolved at the 10 arcmin level. Rotation of the spacecraft is not needed for the signal measurement in the Time Projection Chambers, but provides for measurement and correction of systematic errors. It also allows a small Bragg reflection soft X-ray experiment to be included that can be used for isolated neutron stars and blazars.

ASCA measurements of the grain-scattered X-ray halos of eclipsing massive X-ray binaries: Vela X-1 and Centaurus X-3

NASA Technical Reports Server (NTRS)

Woo, Jonathan W.; Clark, George W.; Day, Charles S. R.; Nagase, Fumiaki; Takeshima, Toshiaki

1994-01-01

We have measured the decaying dust-scattered X-ray halo of Cen X-3 during its binary eclipse with the ASCA solid-state imaging spectrometer (SIS). The surface brightness profile (SBP) of the image in the low-energy band (0.5-3 keV) lies substantially above the point-spread function (PSF) of the X-ray telescope, while the SBP in the high-energy band (5-10 keV) exhibits no significant deviation. By contrast, the SBPs of Vela X-1 during its eclipse are consistent with the PSF in both the low- and high-energy bands -- strong evidence that a dust halo is indeed present in Cen X-3. Accordingly, we modeled the SBP of Cen X-3 taken from six consecutive time segments under the principal assumptions that the dust is distributed uniformly along a segment of the line of sight, the grains have a power-law size distribution, and the low-energy source flux was the same function of orbital phase before as during our observation. The best-fit set of parameters included a grain density value of 1.3 g/cu cm, substanially less than the density of 'astronomical silicate.' This result supports the idea that interstellar grains are 'fluffy' aggregates of smaller solid particles. We attribute the failure to detect a halo of Vela X-1 during its eclipse phase to extended strong circumsource absorption that probably occurred before the eclipse and allowed the halo to decay away before the observation began.

[Development of Nanotechnology for X-Ray Astronomy Instrumentation

NASA Technical Reports Server (NTRS)

Schattenburg, Mark L.

2004-01-01

This Research Grant provides support for development of nanotechnology for x-ray astronomy instrumentation. MIT has made significant progress in several development areas. In the last year we have made considerable progress in demonstrating the high-fidelity patterning and replication of x-ray reflection gratings. We developed a process for fabricating blazed gratings in silicon with extremely smooth and sharp sawtooth profiles, and developed a nanoimprint process for replication. We also developed sophisticated new fixturing for holding thin optics during metrology without causing distortion. We developed a new image processing algorithm for our Shack-Hartmann tool that uses Zernike polynomials. This has resulted in much more accurate and repeatable measurements on thin optics.

Energy distribution measurement of narrow-band ultrashort x-ray beams via K-edge filters subtraction

DOE Office of Scientific and Technical Information (OSTI.GOV)

Cardarelli, Paolo; Di Domenico, Giovanni; Marziani, Michele

2012-10-01

The characterization of novel x-ray sources includes the measurement of the photon flux and the energy distribution of the produced beam. The aim of BEATS2 experiment at the SPARC-LAB facility of the INFN National Laboratories of Frascati (Rome, Italy) is to investigate possible medical applications of an x-ray source based on Thomson relativistic back-scattering. This source is expected to produce a pulsed quasi-monochromatic x-ray beam with an instantaneous flux of 10{sup 20} ph/s in pulses 10 ps long and with an average energy of about 20 keV. A direct measurement of energy distribution of this beam is very difficult withmore » traditional detectors because of the extremely high photon flux. In this paper, we present a method for the evaluation of the energy distribution of quasi-monochromatic x-ray beams based on beam filtration with K-edge absorbing foils in the energy range of interest (16-22 keV). The technique was tested measuring the energy distribution of an x-ray beam having a spectrum similar to the expected one (SPARC-LAB Thomson source) by using a tungsten anode x-ray tube properly filtered and powered. The energy distribution obtained has been compared with the one measured with a HPGe detector showing very good agreement.« less

Soft x-ray reduction camera for submicron lithography

DOEpatents

Hawryluk, A.M.; Seppala, L.G.

1991-03-26

Soft x-ray projection lithography can be performed using x-ray optical components and spherical imaging lenses (mirrors), which form an x-ray reduction camera. The x-ray reduction is capable of projecting a 5x demagnified image of a mask onto a resist coated wafer using 4.5 nm radiation. The diffraction limited resolution of this design is about 135 nm with a depth of field of about 2.8 microns and a field of view of 0.2 cm[sup 2]. X-ray reflecting masks (patterned x-ray multilayer mirrors) which are fabricated on thick substrates and can be made relatively distortion free are used, with a laser produced plasma for the source. Higher resolution and/or larger areas are possible by varying the optic figures of the components and source characteristics. 9 figures.

Testing the Kerr Black Hole Hypothesis Using X-Ray Reflection Spectroscopy

DOE Office of Scientific and Technical Information (OSTI.GOV)

Bambi, Cosimo; Nampalliwar, Sourabh; Cárdenas-Avendaño, Alejandro

We present the first X-ray reflection model for testing the assumption that the metric of astrophysical black holes is described by the Kerr solution. We employ the formalism of the transfer function proposed by Cunningham. The calculations of the reflection spectrum of a thin accretion disk are split into two parts: the calculation of the transfer function and the calculation of the local spectrum at any emission point in the disk. The transfer function only depends on the background metric and takes into account all the relativistic effects (gravitational redshift, Doppler boosting, and light bending). Our code computes the transfermore » function for a spacetime described by the Johannsen metric and can easily be extended to any stationary, axisymmetric, and asymptotically flat spacetime. Transfer functions and single line shapes in the Kerr metric are compared to those calculated from existing codes to check that we reach the necessary accuracy. We also simulate some observations with NuSTAR and LAD/eXTP and fit the data with our new model to show the potential capabilities of current and future observations to constrain possible deviations from the Kerr metric.« less

Testing the Performance and Accuracy of the RELXILL Model for the Relativistic X-Ray Reflection from Accretion Disks

NASA Astrophysics Data System (ADS)

Choudhury, Kishalay; García, Javier A.; Steiner, James F.; Bambi, Cosimo

2017-12-01

The reflection spectroscopic model RELXILL is commonly implemented in studying relativistic X-ray reflection from accretion disks around black holes. We present a systematic study of the model’s capability to constrain the dimensionless spin and ionization parameters from ∼6000 Nuclear Spectroscopic Telescope Array (NuSTAR) simulations of a bright X-ray source employing the lamp-post geometry. We employ high-count spectra to show the limitations in the model without being confused with limitations in signal-to-noise. We find that both parameters are well-recovered at 90% confidence with improving constraints at higher reflection fraction, high spin, and low source height. We test spectra across a broad range—first at 106–107 and then ∼105 total source counts across the effective 3–79 keV band of NuSTAR, and discover a strong dependence of the results on how fits are performed around the starting parameters, owing to the complexity of the model itself. A blind fit chosen over an approach that carries some estimates of the actual parameter values can lead to significantly worse recovery of model parameters. We further stress the importance to span the space of nonlinear-behaving parameters like {log} ξ carefully and thoroughly for the model to avoid misleading results. In light of selecting fitting procedures, we recall the necessity to pay attention to the choice of data binning and fit statistics used to test the goodness of fit by demonstrating the effect on the photon index Γ. We re-emphasize and implore the need to account for the detector resolution while binning X-ray data and using Poisson fit statistics instead while analyzing Poissonian data.

A simple solution to systematic errors in density determination by X-ray reflectivity: The XRR-density evaluation (XRR-DE) method

NASA Astrophysics Data System (ADS)

Bergese, P.; Bontempi, E.; Depero, L. E.

2006-10-01

X-ray reflectivity (XRR) is a non-destructive, accurate and fast technique for evaluating film density. Indeed, sample-goniometer alignment is a critical experimental factor and the overriding error source in XRR density determination. With commercial single-wavelength X-ray reflectometers, alignment is difficult to control and strongly depends on the operator. In the present work, the contribution of misalignment on density evaluation error is discussed, and a novel procedure (named XRR-density evaluation or XRR-DE method) to minimize the problem will be presented. The method allows to overcome the alignment step through the extrapolation of the correct density value from appropriate non-specular XRR data sets. This procedure is operator independent and suitable for commercial single-wavelength X-ray reflectometers. To test the XRR-DE method, single crystals of TiO 2 and SrTiO 3 were used. In both cases the determined densities differed from the nominal ones less than 5.5%. Thus, the XRR-DE method can be successfully applied to evaluate the density of thin films for which only optical reflectivity is today used. The advantage is that this method can be considered thickness independent.

X-ray topographic studies and measurement of lattice parameter differences within synthetic diamonds grown by the reconstitution technique

NASA Astrophysics Data System (ADS)

Wierzchowski, W.; Moore, M.; Makepeace, A. P. W.; Yacoot, A.

1991-10-01

A 4 x 4 x 1.5 cu mm cuboctahedral diamond and two 0.7 mm thick slabs cut from a truncated octahedral diamond grown by the reconstitution technique were studied in different double-crystal arrangements with both conventional and synchrotron X-ray sources. The back-reflection double crystal topographs of large polished 001-plane-oriented faces intersecting different growth sectors, together with cathodoluminescence patterns, allowed identification of these sectors. A double-crystal arrangement, employing the -3 2 5 quartz reflection matching the symmetrical 004 diamond reflection in CuK(alpha 1) radiation, was used for measurement of lattice parameter differences with an accuracy of one and a half parts per million. The simultaneous investigation by means of Lang projection and section topography provided complementary information about the crystallographic defects and internal structures of growth sectors. Observation of the cuboctahedral diamond with a filter of peak transmittance at 430 nm revealed a 'Maltese cross' growth feature in the central (001) growth sector, which also affected the birefringence pattern. However, this feature only very slightly affected the double-crystal topographs.

Coherent x-ray diffraction

NASA Astrophysics Data System (ADS)

Pitney, John Allen

Conventional x-ray diffraction has historically been done under conditions such that the measured signal consists of an incoherent addition of scattering which is coherent only on a length scale determined by the properties of the beam. The result of the incoherent summation is a statistical averaging over the whole illuminated volume of the sample, which yields certain kinds of information with a high degree of precision and has been key to the success of x-ray diffraction in a variety of applications. Coherent x-ray scattering techniques, such as coherent x-ray diffraction (CXD) and x-ray intensity fluctuation spectroscopy (XIFS), attempt to reduce or eliminate any incoherent averaging so that specific, local structures couple to the measurement without being averaged out. In the case of XIFS, the result is analogous to dynamical light scattering, but with sensitivity to length scales less than 200 nm and time scales from 10-3 s to 103 s. When combined with phase retrieval, CXD represents an imaging technique with the penetration, in situ capabilities, and contrast mechanisms associated with x-rays and with a spatial resolution ultimately limited by the x-ray wavelength. In practice, however, the spatial resolution of CXD imaging is limited by exposure to about 100 A. This thesis describes CXD measurements of the binary alloy Cu3Au and the adaptation of phase retrieval methods for the reconstruction of real-space images of Cu3Au antiphase domains. The theoretical foundations of CXD are described in Chapter 1 as derived from the kinematical formulation for x-ray diffraction and from the temporal and spatial coherence of radiation. The antiphase domain structure of Cu 3Au is described, along with the associated reciprocal-space structure which is measured by CXD. CXD measurements place relatively stringent requirements on the coherence properties of the beam and on the detection mechanism of the experiment; these requirements and the means by which they have been

Time Resolved X-Ray Diffraction Study of Acoustoelectrically Amplified Phonons.

NASA Astrophysics Data System (ADS)

Chapman, Leroy Dean

X-rays diffracted by nearly perfect crystals of n-type InSb have been investigated in the presence of intense acoustoelectrically (A.E.) amplified phonons. The fact that these phonons are nearly monochromatic and have a well defined propagation and polarization direction presents an excellent opportunity to investigate the nature of x -ray photon-phonon scattering in a diffracting crystal. The Debye-Waller factor which accounts for the attenuation of diffracted x-ray intensities due to thermal phonons is reflection dependent owing to its sin (theta)/(lamda) dependence. We have performed experiments comparing the (004) and (008) anomalously transmitted intensities as a function of A.E. amplified flux. The attenuation of both reflections due to the amplified phonons was the same in direct contradiction to an expected sin (theta)/(lamda) dependence. Some possible reasons for this failure are discussed. In a Bragg reflection scattering geometry, the intense monochromatic amplified phonons give rise to satellite peaks symmetrically located about the central elastic Brag peak in a rocking profile. We report in this thesis on the first observation of satellites in a thin crystal Laue transmission geometry. We have theoretically simulated the rocking profiles with some success. The A.E. amplification process in InSb is strongly favored for {110} propagation fast transverse (FT) phonons. In earlier experiments it was found that non-{110} FT phonons were also produced during the amplification process. We have developed a time resolved x-ray counting system which, in conjunction with a spatially resolved x-ray beam and a localized, traveling A.E. phonon distribution, allow the time evolution of the amplified distribution to be followed. We report on time resolved measurements for both the symmetric Bragg and Laue geometries from which we can determine when and where non-{110 } FT flux is generated and restrict the possible mechanisms for its generation.

Measurement of X-ray intensity in mammography by a ferroelectric dosimeter

NASA Astrophysics Data System (ADS)

Alter, Albert J.

2005-07-01

Each year in the US over 20 million women undergo mammography, a relatively high dose x-ray examination of the breast, which is relatively sensitive to the carcinogenic effect of ionizing radiation. The radiation risk from mammography is usually expressed in terms of mean glandular dose (MGD) which is calculated as the product of measured entrance exposure (ESE) and a dose conversion factor which is a function of anode material, peak tube voltage (23 to 35 kVp), half-value layer, filtration, compressed breast thickness and breast composition. Mammographic units may have anodes made of molybdenum, rhodium or tungsten and filters of molybdenum, rhodium, or aluminum. In order to accommodate all these parameters, multiple extensive tables of conversion factors are required to cover the range of possibilities. Energy fluence and energy imparted are alternative measures of radiation hazard, which have been used in situations where geometry or filtration is unconventional such as computed tomography or fluoroscopy. Unfortunately, at the present there is no way to directly measure these quantities clinically. In radiation therapy applications, calorimetry has been used to measure energy absorbed. A ferroelectric-based detector has been described that measures energy fluence rate (x-ray intensity) for diagnostic x-ray, 50 to 140 kVp, aluminum filtered tungsten spectrum [Carvalho & Alter: IEEE Transactions 44(6) 1997]. This work explores use of ferroelectric detectors to measure energy fluence, energy fluence rate and energy imparted in mammography. A detector interfaced with a laptop computer was developed to allow measurements on clinical units of five different manufactures having targets of molybdenum, rhodium and tungsten and filters of molybdenum, rhodium, and aluminum of various thicknesses. The measurements provide the first values of energy fluence and energy imparted in mammography. These measurements are compared with conventional parameters such as entrance

Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment.

PubMed

Mom, Rik V; Onderwaater, Willem G; Rost, Marcel J; Jankowski, Maciej; Wenzel, Sabine; Jacobse, Leon; Alkemade, Paul F A; Vandalon, Vincent; van Spronsen, Matthijs A; van Weeren, Matthijs; Crama, Bert; van der Tuijn, Peter; Felici, Roberto; Kessels, Wilhelmus M M; Carlà, Francesco; Frenken, Joost W M; Groot, Irene M N

2017-11-01

A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, 'topographic' tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar. Copyright © 2017 Elsevier B.V. All rights reserved.

History of Chandra X-Ray Observatory

NASA Image and Video Library

2001-01-10

This Chandra image, the first x-ray image ever made of Venus, shows a half crescent due to the relative orientation of the Sun, Earth, and Venus. The x-rays are produced by fluorescent radiation from oxygen and other atoms in the atmosphere between 120 and 140 kilometers above the surface of the planet. In contrast, the optical light from Venus is caused by the reflection from clouds 50 to 70 kilometers above the surface.

X-Ray Standing Waves on Surfaces

DTIC Science & Technology

1993-01-01

dependent distributional changes of iodine on Pt 6.3 X-ray standing wave study of a Langmuir - Blodgett multilayer film 7. Conclusions 8. Acknowledgments...4B. 6.3 X-ray standing wave study of a Langmuir - Blodgett multilayer film As mentioned previously the total external reflection condition occurs...for a Zn atom layer embedded in the top arachidate bilayer of a Langmuir - Blodgett (LB) multilayer film which was deposited on the surface of a gold

Geant4 simulations of soft proton scattering in X-ray optics. A tentative validation using laboratory measurements

NASA Astrophysics Data System (ADS)

Fioretti, Valentina; Mineo, Teresa; Bulgarelli, Andrea; Dondero, Paolo; Ivanchenko, Vladimir; Lei, Fan; Lotti, Simone; Macculi, Claudio; Mantero, Alfonso

2017-12-01

current X-ray telescopes because of the lack of measurements at low energies (< 200 keV) and small reflection angles, so we are not able to address any of the tested models as the one that can certainly reproduce the scattering behavior of low energy protons expected for the ATHENA mission. We can, however, discard multiple scattering as the model able to reproduce soft proton funnelling, and affirm that Coulomb single scattering can represent, until further measurements at lower energies are available, the best approximation of the proton scattered angular distribution at the exit of X-ray optics.

Next Generation X-ray Polarimeter

NASA Astrophysics Data System (ADS)

Hill-Kittle, Joe

The emission regions of many types of X-ray sources are small and cannot be spatially resolved without interferometry techniques that haven't yet been developed. In order to understand the emission mechanisms and emission geometry, alternate measurement techniques are required. Most microphysical processes that affect X-rays, including scattering and magnetic emission processes are imprinted as polarization signatures. X-ray polarization also reveals exotic physical processes occurring in regions of very strong gravitational and magnetic fields. Observations of X-ray polarization will provide a measurement of the geometrical distribution of gas and magnetic fields without foreground depolarization that affects longer wavelengths (e.g. Faraday rotation in the radio). Emission from accretion disks has an inclination-dependent polarization. The polarization signature is modified by extreme gravitational forces, which bend light, essentially changing the contribution of each part of the disk to the integrated total intensity seen by distant observers. Because gravity has the largest effect on the innermost parts of the disk (which are the hottest, and thus contributes to more high energy photons), the energy dependent polarization is diagnostic of disk inclination, black hole mass and spin. Increasing the sensitive energy band will make these measurements possible. X-ray polarimetry will also enable the study of the origin of cosmic rays in the universe, the nature of black holes, the role of black holes in the evolution of galaxies, and the interaction of matter with the highest physically possible magnetic fields. These objectives address NASA's strategic interest in the origin, structure, and evolution of the universe. We propose a two-year effort to develop the Next Generation X-ray Polarimeter (NGXP) that will have more than ten times the sensitivity of the current state of the art. NGXP will make possible game changing measurements of classes of astrophysical

SPECTRAL SURVEY OF X-RAY BRIGHT ACTIVE GALACTIC NUCLEI FROM THE ROSSI X-RAY TIMING EXPLORER

DOE Office of Scientific and Technical Information (OSTI.GOV)

Rivers, Elizabeth; Markowitz, Alex; Rothschild, Richard, E-mail: erivers@ucsd.edu

2011-03-15

Using long-term monitoring data from the Rossi X-ray Timing Explorer (RXTE), we have selected 23 active galactic nuclei (AGNs) with sufficient brightness and overall observation time to derive broadband X-ray spectra from 3 to {approx}>100 keV. Our sample includes mainly radio-quiet Seyferts, as well as seven radio-loud sources. Given the longevity of the RXTE mission, the greater part of our data is spread out over more than a decade, providing truly long-term average spectra and eliminating inconsistencies arising from variability. We present long-term average values of absorption, Fe line parameters, Compton reflection strengths, and photon indices, as well as fluxesmore » and luminosities for the hard and very hard energy bands, 2-10 keV and 20-100 keV, respectively. We find tentative evidence for high-energy rollovers in three of our objects. We improve upon previous surveys of the very hard X-ray energy band in terms of accuracy and sensitivity, particularly with respect to confirming and quantifying the Compton reflection component. This survey is meant to provide a baseline for future analysis with respect to the long-term averages for these sources and to cement the legacy of RXTE, and especially its High Energy X-ray Timing Experiment, as a contributor to AGN spectral science.« less

X-ray tube with magnetic electron steering

DOEpatents

Reed, Kim W.; Turman, Bobby N.; Kaye, Ronald J.; Schneider, Larry X.

2000-01-01

An X-ray tube uses a magnetic field to steer electrons. The magnetic field urges electrons toward the anode, increasing the proportion of electrons emitted from the cathode that reach desired portions of the anode and consequently contribute to X-ray production. The magnetic field also urges electrons reflected from the anode back to the anode, further increasing the efficiency of the tube.

X-ray filter for x-ray powder diffraction

DOE Office of Scientific and Technical Information (OSTI.GOV)

Sinsheimer, John Jay; Conley, Raymond P.; Bouet, Nathalie C. D.

Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and wallsmore » defining second slits. The second slits may include arc shaped openings through the second plate. The walls of the second plate may be configured to absorb at least some of second x-rays and to output third x-rays.« less

Polarization and long-term variability of Sgr A* X-ray echo

NASA Astrophysics Data System (ADS)

Churazov, E.; Khabibullin, I.; Ponti, G.; Sunyaev, R.

2017-06-01

We use a model of the molecular gas distribution within ˜100 pc from the centre of the Milky Way (Kruijssen, Dale & Longmore) to simulate time evolution and polarization properties of the reflected X-ray emission, associated with the past outbursts from Sgr A*. While this model is too simple to describe the complexity of the true gas distribution, it illustrates the importance and power of long-term observations of the reflected emission. We show that the variable part of X-ray emission observed by Chandra and XMM-Newton from prominent molecular clouds is well described by a pure reflection model, providing strong support of the reflection scenario. While the identification of Sgr A* as a primary source for this reflected emission is already a very appealing hypothesis, a decisive test of this model can be provided by future X-ray polarimetric observations, which will allow placing constraints on the location of the primary source. In addition, X-ray polarimeters (like, e.g. XIPE) have sufficient sensitivity to constrain the line-of-sight positions of molecular complexes, removing major uncertainty in the model.

Development of an X-ray fluorescence holographic measurement system for protein crystals

NASA Astrophysics Data System (ADS)

Sato-Tomita, Ayana; Shibayama, Naoya; Happo, Naohisa; Kimura, Koji; Okabe, Takahiro; Matsushita, Tomohiro; Park, Sam-Yong; Sasaki, Yuji C.; Hayashi, Kouichi

2016-06-01

Experimental procedure and setup for obtaining X-ray fluorescence hologram of crystalline metalloprotein samples are described. Human hemoglobin, an α2β2 tetrameric metalloprotein containing the Fe(II) heme active-site in each chain, was chosen for this study because of its wealth of crystallographic data. A cold gas flow system was introduced to reduce X-ray radiation damage of protein crystals that are usually fragile and susceptible to damage. A χ-stage was installed to rotate the sample while avoiding intersection between the X-ray beam and the sample loop or holder, which is needed for supporting fragile protein crystals. Huge hemoglobin crystals (with a maximum size of 8 × 6 × 3 mm3) were prepared and used to keep the footprint of the incident X-ray beam smaller than the sample size during the entire course of the measurement with the incident angle of 0°-70°. Under these experimental and data acquisition conditions, we achieved the first observation of the X-ray fluorescence hologram pattern from the protein crystals with minimal radiation damage, opening up a new and potential method for investigating the stereochemistry of the metal active-sites in biomacromolecules.

Dilation x-ray imager a new∕faster gated x-ray imager for the NIF.

PubMed

Nagel, S R; Hilsabeck, T J; Bell, P M; Bradley, D K; Ayers, M J; Barrios, M A; Felker, B; Smith, R F; Collins, G W; Jones, O S; Kilkenny, J D; Chung, T; Piston, K; Raman, K S; Sammuli, B; Hares, J D; Dymoke-Bradshaw, A K L

2012-10-01

As the yield on implosion shots increases it is expected that the peak x-ray emission reduces to a duration with a FWHM as short as 20 ps for ∼7 × 10(18) neutron yield. However, the temporal resolution of currently used gated x-ray imagers on the NIF is 40-100 ps. We discuss the benefits of the higher temporal resolution for the NIF and present performance measurements for dilation x-ray imager, which utilizes pulse-dilation technology [T. J. Hilsabeck et al., Rev. Sci. Instrum. 81, 10E317 (2010)] to achieve x-ray imaging with temporal gate times below 10 ps. The measurements were conducted using the COMET laser, which is part of the Jupiter Laser Facility at the Lawrence Livermore National Laboratory.

Performance of NICER flight x-ray concentrator

NASA Astrophysics Data System (ADS)

Okajima, Takashi; Soong, Yang; Balsamo, Erin R.; Enoto, Teruaki; Olsen, Larry; Koenecke, Richard; Lozipone, Larry; Kearney, John; Fitzsimmons, Sean; Numata, Ai; Kenyon, Steven J.; Arzoumanian, Zaven; Gendreau, Keith

2016-07-01

Neutron star Interior Composition ExploreR (NICER) is a NASA instrument to be onboard International Space Station, which is equipped with 56 pairs of an X-ray concentrator (XRC) and a silicon drift detector for high timing observations. The XRC is based on an epoxy replicated thin aluminum foil X-ray mirror, similar to those of Suzaku and ASTRO-H (Hitomi), but only a single stage parabolic grazing incidence optic. Each has a focal length of 1.085m and a diameter of 105 mm, with 24 confocally aligned parabolic shells. Grazing incident angles to individual shells range from 0.4 to 1.4 deg. The flight 56 XRCs have been completed and successfully delivered to the payload integration. All the XRC was characterized at the NASA/GSFC 100-m X-ray beamline using 1.5 keV X-rays (some of them are also at 4.5 keV). The XRC performance, effective area and point spread function, was measured by a CCD camera and a proportional counter. The average effective area is about 44 cm2 at 1.5 keV and about 18 cm2 at 4.5 keV, which is consistent with a micro-roughness of 0.5nm from individual shell reflectivity measurements. The XRC focuses about 91% of X-rays into a 2mm aperture at the focal plane, which is the NICER detector window size. Each XRC weighs only 325 g. These performance met the project requirement. In this paper, we will present summary of the flight XRC performance as well as co-alignment results of the 56 XRCs on the flight payload as it is important to estimate the total effective for astronomical observations.

Chandra X-Ray Observatory Image of Black Hole

NASA Technical Reports Server (NTRS)

2000-01-01

This Chandra X-Ray Observatory (CXO) image is a spectrum of a black hole, which is similar to the colorful spectrum of sunlight produced by a prism. The x-rays of interest are shown here recorded in bright stripes that run rightward and leftward from the center of the image. These x-rays are sorted precisely according to their energy with the highest-energy x-rays near the center of the image and the lower-energy x-rays farther out. The spectrum was obtained by using the Low Energy Transmission Grating (LETG), which intercepts x-rays and changes their direction by the amounts that depend sensitively on the x-ray energy. The assembly holds 540 gold transmission gratings. When in place behind the mirrors, the gratings intercept the x-rays reflected from the telescope. The bright spot at the center is due to a fraction of the x-ray radiation that is not deflected by the LETG. The spokes that intersect the central spot and the faint diagonal rays that flank the spectrum itself are artifacts due to the structure that supports the LETG grating elements. (Photo credit: NASA Cfa/J. McClintock et al)

Experimental investigation of a HOPG crystal fan for x-ray fluorescence molecular imaging

NASA Astrophysics Data System (ADS)

Rosentreter, Tanja; Müller, Bernhard; Schlattl, Helmut; Hoeschen, Christoph

2017-03-01

Imaging x-ray fluorescence generally generates a conflict between the best image quality or highest sensitivity and lowest possible radiation dose. Consequently many experimental studies investigating the feasibility of this molecular imaging method, deal with either monochromatic x-ray sources that are not practical in clinical environment or accept high x-ray doses in order to maintain the advantage of high sensitivity and producing high quality images. In this work we present a x-ray fluorescence imaging setup using a HOPG crystal fan construction consisting of a Bragg reflecting analyzer array together with a scatter reducing radial collimator. This method allows for the use of polychromatic x-ray tubes that are in general easily accessible in contrast to monochromatic x-ray sources such as synchrotron facilities. Moreover this energy-selecting device minimizes the amount of Compton scattered photons while simultaneously increasing the fluorescence signal yield, thus significantly reducing the signal to noise ratio. The aim is to show the feasibility of this approach by measuring the Bragg reflected Kα fluorescence signal of an object containing an iodine solution using a large area detector with moderate energy resolution. Contemplating the anisotropic energy distribution of background scattered x-rays we compare the detection sensitivity, applying two different detector angular configurations. Our results show that even for large area detectors with limited energy resolution, iodine concentrations of 0.12 % can be detected. However, the potentially large scan times and therefore high radiation dose need to be decreased in further investigations.

Automatic tool alignment in a backscatter X-ray scanning system

DOEpatents

Garretson, Justin; Hobart, Clinton G.; Gladwell, Thomas S.; Monda, Mark J.

2015-11-17

Technologies pertaining to backscatter x-ray scanning systems are described herein. The backscatter x-ray scanning system includes an x-ray source, which directs collimated x-rays along a plurality of output vectors towards a target. A detector detects diffusely reflected x-rays subsequent to respective collimated x-rays impacting the target, and outputs signals indicative of parameters of the detected x-rays. An image processing system generates an x-ray image based upon parameters of the detected x-rays, wherein each pixel in the image corresponds to a respective output vector. A user selects a particular portion of the image, and a medical device is positioned such that its directional axis is coincident with the output vector corresponding to at least one pixel in the portion of the image.

Automatic tool alignment in a backscatter x-ray scanning system

DOEpatents

Garretson, Justin; Hobart, Clinton G.; Gladwell, Thomas S.; Monda, Mark J.

2015-06-16

Technologies pertaining to backscatter x-ray scanning systems are described herein. The backscatter x-ray scanning system includes an x-ray source, which directs collimated x-rays along a plurality of output vectors towards a target. A detector detects diffusely reflected x-rays subsequent to respective collimated x-rays impacting the target, and outputs signals indicative of parameters of the detected x-rays. An image processing system generates an x-ray image based upon parameters of the detected x-rays, wherein each pixel in the image corresponds to a respective output vector. A user selects a particular portion of the image, and a tool is positioned such that its directional axis is coincident with the output vector corresponding to at least one pixel in the portion of the image.

First Search for an X-Ray-Optical Reverberation Signal in an Ultraluminous X-Ray Source

NASA Technical Reports Server (NTRS)

Pasham, Dheeraj R.; Strohmayer, Tod E.; Cenko, S. Bradley; Trippe, Margaret L.; Mushotzky, Richard F.; Gandhi, Poshak

2016-01-01

Using simultaneous optical (VLT/FORS2) and X-ray (XMM-Newton) data of NGC 5408, we present the first ever attempt to search for a reverberation signal in an ultraluminous X-ray source (NGC 5408 X-1). The idea is similar to active galactic nucleus broad line reverberation mapping where a lag measurement between the X-ray and the optical flux combined with a Keplerian velocity estimate should enable us to weigh the central compact object. We find that although NGC 5408 X-1's X-rays are variable on a timescale of a few hundred seconds (rms of 9.0 +/- 0.5%), the optical emission does not show any statistically significant variations. We set a 3s upper limit on the rms optical variability of 3.3%. The ratio of the X-ray to the optical variability is an indicator of X-ray reprocessing efficiency. In X-ray binaries, this ratio is roughly 5. Assuming a similar ratio for NGC 5408 X-1, the expected rms optical variability is approximately equal to 2%, which is still a factor of roughly two lower than what was possible with the VLT observations in this study. We find marginal evidence (3 sigma) for optical variability on an approximately 24 hr timescale. Our results demonstrate that such measurements can be made, but photometric conditions, low sky background levels, and longer simultaneous observations will be required to reach optical variability levels similar to those of X-ray binaries.

Measuring Quasar Spin via X-ray Continuum Fitting

NASA Astrophysics Data System (ADS)

Jenkins, Matthew; Pooley, David; Rappaport, Saul; Steiner, Jack

2018-01-01

We have identified several quasars whose X-ray spectra appear very soft. When fit with power-law models, the best-fit indices are greater than 3. This is very suggestive of thermal disk emission, indicating that the X-ray spectrum is dominated by the disk component. Galactic black hole binaries in such states have been successfully fit with disk-blackbody models to constrain the inner radius, which also constrains the spin of the black hole. We have fit those models to XMM-Newton spectra of several of our identified soft X-ray quasars to place constraints on the spins of the supermassive black holes.

Spatially resolved density and ionization measurements of shocked foams using x-ray fluorescence

DOE Office of Scientific and Technical Information (OSTI.GOV)

MacDonald, M. J.; Keiter, P. A.; Montgomery, D. S.

2016-09-28

We present experiments at the Trident laser facility demonstrating the use of x-ray fluorescence (XRF) to simultaneously measure density, ionization state populations, and electron temperature in shocked foams. An imaging x-ray spectrometer obtained spatially resolved measurements of Ti K-α emission. Density profiles were measured from K-α intensity. Ti ionization state distributions and electron temperatures were inferred by fitting K-α spectra to spectra from CRETIN simulations. This work shows that XRF provides a powerful tool to complement other diagnostics to make equation of state measurements of shocked materials containing a suitable tracer element.

Design, Fabrication and Testing of Multilayer Coated X-Ray Optics for the Water Window Imaging X-Ray Microscope

NASA Technical Reports Server (NTRS)

Spencer, Dwight C.

1996-01-01

Hoover et. al. built and tested two imaging Schwarzschild multilayer microscopes. These instruments were constructed as prototypes for the "Water Window Imaging X-Ray Microscope," which is a doubly reflecting, multilayer x-ray microscope configured to operate within the "water window." The "water window" is the narrow region of the x-ray spectrum between the K absorption edges of oxygen (lamda = 23.3 Angstroms) and of carbon (lamda = 43.62 Angstroms), where water is relatively highly transmissive and carbon is highly absorptive. This property of these materials, thus permits the use of high resolution multilayer x-ray microscopes for producing high contrast images of carbon-based structures within the aqueous physiological environments of living cells. We report the design, fabrication and testing of multilayer optics that operate in this regime.

Optics for coherent X-ray applications

PubMed Central

Yabashi, Makina; Tono, Kensuke; Mimura, Hidekazu; Matsuyama, Satoshi; Yamauchi, Kazuto; Tanaka, Takashi; Tanaka, Hitoshi; Tamasaku, Kenji; Ohashi, Haruhiko; Goto, Shunji; Ishikawa, Tetsuya

2014-01-01

Developments of X-ray optics for full utilization of diffraction-limited storage rings (DLSRs) are presented. The expected performance of DLSRs is introduced using the design parameters of SPring-8 II. To develop optical elements applicable to manipulation of coherent X-rays, advanced technologies on precise processing and metrology were invented. With propagation-based coherent X-rays at the 1 km beamline of SPring-8, a beryllium window fabricated with the physical-vapour-deposition method was found to have ideal speckle-free properties. The elastic emission machining method was utilized for developing reflective mirrors without distortion of the wavefronts. The method was further applied to production of diffraction-limited focusing mirrors generating the smallest spot size in the sub-10 nm regime. To enable production of ultra-intense nanobeams at DLSRs, a low-vibration cooling system for a high-heat-load monochromator and advanced diagnostic systems to characterize X-ray beam properties precisely were developed. Finally, new experimental schemes for combinative nano-analysis and spectroscopy realised with novel X-ray optics are discussed. PMID:25177986

Optics for coherent X-ray applications.

PubMed

Yabashi, Makina; Tono, Kensuke; Mimura, Hidekazu; Matsuyama, Satoshi; Yamauchi, Kazuto; Tanaka, Takashi; Tanaka, Hitoshi; Tamasaku, Kenji; Ohashi, Haruhiko; Goto, Shunji; Ishikawa, Tetsuya

2014-09-01

Developments of X-ray optics for full utilization of diffraction-limited storage rings (DLSRs) are presented. The expected performance of DLSRs is introduced using the design parameters of SPring-8 II. To develop optical elements applicable to manipulation of coherent X-rays, advanced technologies on precise processing and metrology were invented. With propagation-based coherent X-rays at the 1 km beamline of SPring-8, a beryllium window fabricated with the physical-vapour-deposition method was found to have ideal speckle-free properties. The elastic emission machining method was utilized for developing reflective mirrors without distortion of the wavefronts. The method was further applied to production of diffraction-limited focusing mirrors generating the smallest spot size in the sub-10 nm regime. To enable production of ultra-intense nanobeams at DLSRs, a low-vibration cooling system for a high-heat-load monochromator and advanced diagnostic systems to characterize X-ray beam properties precisely were developed. Finally, new experimental schemes for combinative nano-analysis and spectroscopy realised with novel X-ray optics are discussed.

Accretion torques in X-ray pulsars

NASA Technical Reports Server (NTRS)

Rappaport, S.; Joss, P. C.

1977-01-01

An analysis of the accretion process in an X-ray pulsar, whereby angular momentum is transferred to the star and its rotation period is changed, is presented, and an expression for the fractional rate of change of the pulse period in terms of X-ray luminosity and other star parameters is derived. It is shown that observed characteristic spin-up time scales for seven X-ray pulsars strongly support the view that in every source (1) the pulse period reflects the rotation period of a compact object, (2) the accretion is mediated by a disk surrounding the compact object and rotating in the same sense, and (3) the compact object is a neutron star rather than a white dwarf.

Digital X-ray camera for quality evaluation three-dimensional topographic reconstruction of single crystals of biological macromolecules

NASA Technical Reports Server (NTRS)

Borgstahl, Gloria (Inventor); Lovelace, Jeff (Inventor); Snell, Edward Holmes (Inventor); Bellamy, Henry (Inventor)

2008-01-01

The present invention provides a digital topography imaging system for determining the crystalline structure of a biological macromolecule, wherein the system employs a charge coupled device (CCD) camera with antiblooming circuitry to directly convert x-ray signals to electrical signals without the use of phosphor and measures reflection profiles from the x-ray emitting source after x-rays are passed through a sample. Methods for using said system are also provided.

X-ray Thomson scattering measurements of temperature and density from multi-shocked CH capsules

DOE PAGES

Fletcher, L. B.; Glenzer, S. H.; Kritcher, A.; ...

2013-05-24

Proof-of-principle measurements of the electron densities, temperatures, and ionization states of spherically compressed multi-shocked CH (polystyrene) capsules have been achieved using spectrally resolved x-ray Thomson scattering. A total energy of 13.5 kJ incident on target is used to compress a 70 μm thick CH shell above solid-mass density using three coalescing shocks. Separately, a laser-produced zinc He-α x-ray source at 9 keV delayed 200 ps-800 ps after maximum compression is used to probe the plasma in the non-collective scattering regime. The data show that x-ray Thomson scattering enables a complete description of the time-dependent hydrodynamic evolution of shock-compressed CH capsules,more » with a maximum measured density of ρ > 6 g cm –3. Additionally, the results demonstrate that accurate measurements of x-ray scattering from bound-free transitions in the CH plasma demonstrate strong evidence that continuum lowering is the primary ionization mechanism of carbon L-shell electrons.« less

Measurements of reciprocity law failure in green-sensitive X-ray films.

PubMed

Arnold, B A; Eisenberg, H; Bjärngard, B E

1978-02-01

Reciprocity law failure was measured for four brands of medical x-ray films exposed with intensifying screens. Three of the films are green light-sensitized for use in combination with green light-emitting rare-earth screens. These films showed larger reciprocity failure effects than one conventional blue-sensitive film, Dupont Cronex-2. Development conditions had a small effect on reciprocity failure. As part of the investigation, a detector was constructed with a response that accurately monitors the light emission from the double screen-cassette combination over a wide range of x-ray photon energies.

Ground-based x-ray calibration of the Astro-H/Hitomi soft x-ray telescopes

NASA Astrophysics Data System (ADS)

Iizuka, Ryo; Hayashi, Takayuki; Maeda, Yoshitomo; Ishida, Manabu; Tomikawa, Kazuki; Sato, Toshiki; Kikuchi, Naomichi; Okajima, Takashi; Soong, Yang; Serlemitsos, Peter J.; Mori, Hideyuki; Izumiya, Takanori; Minami, Sari

2018-01-01

We present the summary of the on-ground calibration of two soft x-ray telescopes (SXT-I and SXT-S), developed by NASA's Goddard Space Flight Center (GSFC), onboard Astro-H/Hitomi. After the initial x-ray measurements with a diverging beam at the GSFC 100-m beamline, we performed the full calibration of the x-ray performance, using the 30-m x-ray beamline facility at the Institute of Space and Astronautical Science of Japan Aerospace Exploration Agency in Japan. We adopted a raster scan method with a narrow x-ray pencil beam with a divergence of ˜15″. The on-axis effective area (EA), half-power diameter, and vignetting function were measured at several energies between 1.5 and 17.5 keV. The detailed results appear in tables and figures in this paper. We measured and evaluated the performance of the SXT-S and the SXT-I with regard to the detector-limited field-of-view and the pixel size of the paired flight detector, i.e., SXS and the SXI, respectively. The primary items measured are the EA, image quality, and stray light for on-axis and off-axis sources. The accurate measurement of these parameters is vital to make the precise response function of the ASTRO-H SXTs. This paper presents the definitive results of the ground-based calibration of the ASTRO-H SXTs.

Multi-scale mechanics of granular solids from grain-resolved X-ray measurements

NASA Astrophysics Data System (ADS)

Hurley, R. C.; Hall, S. A.; Wright, J. P.

2017-11-01

This work discusses an experimental technique for studying the mechanics of three-dimensional (3D) granular solids. The approach combines 3D X-ray diffraction and X-ray computed tomography to measure grain-resolved strains, kinematics and contact fabric in the bulk of a granular solid, from which continuum strains, grain stresses, interparticle forces and coarse-grained elasto-plastic moduli can be determined. We demonstrate the experimental approach and analysis of selected results on a sample of 1099 stiff, frictional grains undergoing multiple uniaxial compression cycles. We investigate the inter-particle force network, elasto-plastic moduli and associated length scales, reversibility of mechanical responses during cyclic loading, the statistics of microscopic responses and microstructure-property relationships. This work serves to highlight both the fundamental insight into granular mechanics that is furnished by combined X-ray measurements and describes future directions in the field of granular materials that can be pursued with such approaches.

High resolution X- and gamma-ray spectroscopy of cosmic X-ray sources

NASA Technical Reports Server (NTRS)

Lin, R. P.

1983-01-01

A high resolution X-ray spectrometer and large area phoswich detector were designed and co-aligned in a common elevation mounting in order to measure solar and cosmic X-ray and gamma ray emission in the 13 to 600 KeV energy range from a balloon. The instrument is described and results obtained for the Crab Nebula, the supernova remnant Cas A, and the Sun are discussed and analyzed.

Relativistic Disk Reflection in the Neutron Star X-Ray BinaryXTE J1709-267 with NuSTAR

NASA Astrophysics Data System (ADS)

Ludlam, R. M.; Miller, J. M.; Cackett, E. M.; Degenaar, N.; Bostrom, A. C.

2017-04-01

We perform the first reflection study of the soft X-ray transient and Type 1 burst source XTE J1709-267 using NuSTAR observations during its 2016 June outburst. There was an increase in flux near the end of the observations, which corresponds to an increase from ˜0.04 L Edd to ˜0.06 L Edd assuming a distance of 8.5 kpc. We have separately examined spectra from the low- and high-flux intervals, which are soft and show evidence of a broad Fe K line. Fits to these intervals with relativistic disk reflection models have revealed an inner-disk radius of {13.8}-1.8+3.0 {R}g (where {R}g={GM}/{c}2) for the low-flux spectrum and {23.4}-5.4+15.6 {R}g for the high-flux spectrum at the 90% confidence level. The disk is likely truncated by a boundary layer surrounding the neutron star (NS) or the magnetosphere. Based on the measured luminosity and the accretion efficiency for a disk around an NS, we estimate that the theoretically expected size for the boundary layer would be ˜ 0.9{--}1.1 {R}g from the NS’s surface, which can be increased by spin or viscosity effects. Another plausible scenario is that the disk could be truncated by the magnetosphere. We place a conservative upper limit on the strength of the magnetic field at the poles (assuming {a}* =0 and {M}{NS}=1.4{M}⊙ ) of B≤slant 0.75-3.70× {10}9 G, though X-ray pulsations have not been detected from this source.

Si Lattice, Avogadro Constant, and X- and Gamma-Ray Measurements: Contributions by R.D. Deslattes

NASA Astrophysics Data System (ADS)

Kessler, Jr.

2002-04-01

The achievement of x-ray interferometry in 1965 opened the possibility of more accurately measuring the lattice spacing of a diffraction crystal on a scale directly tied to the SI system of units. The road from the possible to reality required moving objects and measuring translations with sub-atomic accuracy. The improved crystal lattice spacing determinations had a significant impact on two fundamental measurement areas: 1) the amount of substance (the mole and the associated Avogadro Constant), and 2) short wavelengths (the x- and gamma-ray regions). Progress in both areas required additional metrological advances: density and isotopic abundance measurements are needed for the Avogadro constant and small angle measurements are required for the determination of short wavelengths. The x- and gamma-ray measurements have led to more accurate wavelength standards and neutron binding energy measurements that connect gamma-ray measurements to precision atomic mass measurements, particularly the neutron mass. Richard D. Deslattes devoted much of his scientific career to this measurement program. His outstanding contributions and insights will be reviewed.

Probing Galactic Center Cosmic-Rays in the X-ray Regime

NASA Astrophysics Data System (ADS)

Zhang, Shuo; Baganoff, Frederick K.; Bulbul, Esra; Miller, Eric D.; Bautz, Mark W.

2017-08-01

The central few hundred parsecs of the Galaxy harbors 5-10% of the molecular gas mass of the entire Milky Way. This central molecular zone exhibits 6.4 keV Fe Kα line and continuum X-ray emission with time-variability. The time-variable X-ray emission from the gas clouds is best explained by light echoes of past X-ray outbursts from the central supermassive black hole Sgr A*. However,MeV-GeV cosmic-ray particles may also contribute to a constant X-ray emission component from the clouds, through collisional ionization and bremsstrahlung. Sgr B2 is the densest and most massive cloud in the central molecular zone. It is the only known gas cloud whose X-ray emission has kept fading over the past decade and will soon reach a constant X-ray level in 2017/2018, and thus serves as the best probe for MeV-GeV particles in the central 100 pc of the Galaxy. At the same time, the Fe Kα emission has also been discovered from molecular structures beyond the central molecular zone, extening to ~1 kpc from the Galactic center. The X-ray reflection scenario meets challenges this far from the Galactic center, while the MeV-GeV cosmic-ray electrons serve as a more natural explanation. Our studies on Sgr B2 and the large-scale moleuclar structures will for the first time constrain the MeV-GeV particles in the Galactic center, and point to their origin: whether they rise from particle acceleration or dark matter annihilation.

Theoretical modeling of a portable x-ray tube based KXRF system to measure lead in bone.

PubMed

Specht, Aaron J; Weisskopf, Marc G; Nie, Linda Huiling

2017-03-01

K-shell x-ray fluorescence (KXRF) techniques have been used to identify health effects resulting from exposure to metals for decades, but the equipment is bulky and requires significant maintenance and licensing procedures. A portable x-ray fluorescence (XRF) device was developed to overcome these disadvantages, but introduced a measurement dependency on soft tissue thickness. With recent advances to detector technology, an XRF device utilizing the advantages of both systems should be feasible. In this study, we used Monte Carlo simulations to test the feasibility of an XRF device with a high-energy x-ray tube and detector operable at room temperature. We first validated the use of Monte Carlo N-particle transport code (MCNP) for x-ray tube simulations, and found good agreement between experimental and simulated results. Then, we optimized x-ray tube settings and found the detection limit of the high-energy x-ray tube based XRF device for bone lead measurements to be 6.91 µg g -1 bone mineral using a cadmium zinc telluride detector. In conclusion, this study validated the use of MCNP in simulations of x-ray tube physics and XRF applications, and demonstrated the feasibility of a high-energy x-ray tube based XRF for metal exposure assessment.

Theoretical modeling of a portable x-ray tube based KXRF system to measure lead in bone

PubMed Central

Specht, Aaron J; Weisskopf, Marc G; Nie, Linda Huiling

2017-01-01

Objective K-shell x-ray fluorescence (KXRF) techniques have been used to identify health effects resulting from exposure to metals for decades, but the equipment is bulky and requires significant maintenance and licensing procedures. A portable x-ray fluorescence (XRF) device was developed to overcome these disadvantages, but introduced a measurement dependency on soft tissue thickness. With recent advances to detector technology, an XRF device utilizing the advantages of both systems should be feasible. Approach In this study, we used Monte Carlo simulations to test the feasibility of an XRF device with a high-energy x-ray tube and detector operable at room temperature. Main Results We first validated the use of Monte Carlo N-particle transport code (MCNP) for x-ray tube simulations, and found good agreement between experimental and simulated results. Then, we optimized x-ray tube settings and found the detection limit of the high-energy x-ray tube based XRF device for bone lead measurements to be 6.91 μg g−1 bone mineral using a cadmium zinc telluride detector. Significance In conclusion, this study validated the use of MCNP in simulations of x-ray tube physics and XRF applications, and demonstrated the feasibility of a high-energy x-ray tube based XRF for metal exposure assessment. PMID:28169835

Spatial coherence measurements and x-ray holographic imaging using a laser-generated plasma x-ray source in the water window spectral region

NASA Astrophysics Data System (ADS)

Turcu, I. C. E.; Ross, I. N.; Schulz, M. S.; Daido, H.; Tallents, G. J.; Krishnan, J.; Dwivedi, L.; Hening, A.

1993-06-01

The properties of a coherent x-ray point source in the water window spectral region generated using a small commercially available KrF laser system focused onto a Mylar (essentially carbon) target have been measured. By operating the source in a low-pressure (approximately 20 Torr) nitrogen environment, the degree of monochromaticity was improved due to the nitrogen acting as an x-ray filter and relatively enhancing the radiation at a wavelength of 3.37 nm (C vi 1s-2p). X-ray pinhole camera images show a minimum source size of 12 μm. A Young's double slit coherence measurement gave fringe visibilities of approximately 62% for a slit separation of 10.5 μm at a distance of 31.7 cm from the source. To demonstrate the viability of the laser plasma as a source for coherent imaging applications a Gabor (in-line) hologram of two carbon fibers, of different sizes, was produced. The exposure time and the repetition rate was 2 min and 10 Hz, respectively.

X ray microscope assembly and alignment support and advanced x ray microscope design and analysis

NASA Technical Reports Server (NTRS)

Shealy, David L.

1991-01-01

Considerable efforts have been devoted recently to the design, analysis, fabrication, and testing of spherical Schwarzschild microscopes for soft x ray application in microscopy and projection lithography. The spherical Schwarzschild microscope consists of two concentric spherical mirrors configured such that the third order spherical aberration and coma are zero. Since multilayers are used on the mirror substrates for x ray applications, it is desirable to have only two reflecting surfaces in a microscope. In order to reduce microscope aberrations and increase the field of view, generalized mirror surface profiles have been considered in this investigation. Based on incoherent and sine wave modulation transfer function (MTF) calculations, the object plane resolution of a microscope has been analyzed as a function of the object height and numerical aperture (NA) of the primary for several spherical Schwarzschild, conic, and aspherical head reflecting two mirror microscope configurations.

Visible light scatter measurements of the Advanced X-ray Astronomical Facility /AXAF/ mirror samples

NASA Technical Reports Server (NTRS)

Griner, D. B.

1981-01-01

NASA is studying the properties of mirror surfaces for X-ray telescopes, the data of which will be used to develop the telescope system for the Advanced X-ray Astronomical Facility. Visible light scatter measurements, using a computer controlled scanner, are made of various mirror samples to determine surface roughness. Total diffuse scatter is calculated using numerical integration techniques and used to estimate the rms surface roughness. The data measurements are then compared with X-ray scatter measurements of the same samples. A summary of the data generated is presented, along with graphs showing changes in scatter on samples before and after cleaning. Results show that very smooth surfaces can be polished on the common substrate materials (from 2 to 10 Angstroms), and nickel appears to give the lowest visible light scatter.

Nighttime sensitivity of ionospheric VLF measurements to X-ray bursts from a remote cosmic source

NASA Astrophysics Data System (ADS)

Raulin, Jean-Pierre; Trottet, Gérard; Giménez de Castro, C. Guillermo; Correia, Emilia; Macotela, E. Liliana

2014-06-01

On 22 January 2009, a series of X-ray bursts were emitted by the soft gamma ray repeater SGR J1550-5418. Some of these bursts produced enhanced ionization in the nighttime lower ionosphere. These ionospheric disturbances were studied using X-ray measurements from the Anti-Coincidence Shield of the Spectrometer for Integral onboard the International Gamma-Ray Astrophysics Laboratory and simultaneous phase and amplitude records from two VLF propagation paths between the transmitter Naval Radio Station, Pearl Harbor (Hawaii) and the receivers Radio Observatorio do Itapetinga (Brazil) and Estação Antarctica Commandante Ferraz (Antarctic Peninsula). The VLF measurements have been obtained with an unprecedented high time resolution of 20 ms. We find that the illumination factor I (illuminated path length times the cosine of the zenith angle), which characterizes the propagation paths underlying the flaring object, is a key parameter which determines the sensitivity threshold of the VLF detection of X-ray bursts from nonsolar transients. For the present VLF measurements of bursts from SGR J1550-5418, it is found that for I ≥ 1.8 Mm, all X-ray bursts with fluence in the 25 keV to 2 MeV range larger than F25_min 1.0 × 10-6 erg/cm2 produce a measurable ionospheric disturbance. Such a lower limit of the X-ray fluence value indicates that moderate X-ray bursts, as opposed to giant X-ray bursts, do produce ionospheric disturbances larger than the sensitivity limit of the VLF technique. Therefore, the frequency of detection of such events could be improved, for example by increasing the coverage of existing VLF receiving networks. The VLF detection of high-energy astrophysical bursts then appears as an important observational diagnostic to complement their detection in space. This would be especially important when space observations suffer from adverse conditions, like saturation, occultation from the Earth, or the passage of the spacecraft through the South Atlantic

X-ray scattering signatures of β-thalassemia

NASA Astrophysics Data System (ADS)

Desouky, Omar S.; Elshemey, Wael M.; Selim, Nabila S.

2009-08-01

X-ray scattering from lyophilized proteins or protein-rich samples is characterized by the presence of two characteristic broad peaks at scattering angles equivalent to momentum transfer values of 0.27 and 0.6 nm -1, respectively. These peaks arise from the interference of coherently scattered photons. Once the conformation of a protein is changed, these two peaks reflect such change with considerable sensitivity. The present work examines the possibility of characterizing the most common cause of hemolytic anaemia in Egypt and many Mediterranean countries; β-thalassemia, from its X-ray scattering profile. This disease emerges from a genetic defect causing reduced rate in the synthesis of one of the globin chains that make up hemoglobin. As a result, structurally abnormal hemoglobin molecules are formed. In order to detect such molecular disorder, hemoglobin samples of β-thalassemia patients are collected, lyophilized and measured using a conventional X-ray diffractometer. Results show significant differences in the X-ray scattering profiles of most of the diseased samples compared to control. The shape of the first scattering peak at 0.27 nm -1, in addition to the relative intensity of the first to the second scattering peaks, provides the most reliable signs of abnormality in diseased samples. The results are interpreted and confirmed with the aid of Fourier Transform Infrared (FTIR) spectroscopy of normal and thalassemia samples.

Specific features of thermocouple calorimeter application for measurements of pulsed X-ray emission from plasma

DOE Office of Scientific and Technical Information (OSTI.GOV)

Gavrilov, V. V.; Fasakhov, I. K.

2012-01-15

It is shown that the accuracy of time-integrated measurements of pulsed X-ray emission from hot plasma with calibrated thermocouple calorimeters is mainly determined by two factors. The first and the most important factor is heating of the filter by the absorbed X-rays; as a result, the calorimeter measures the thermal radiation of the filter, which causes appreciable distortion of the temporal profile and amplitude of the recorded signal. The second factor is the dependence of the effective depth of X-ray absorption in the dielectric that covers the entrance window of the calorimeter on the energy of X-ray photons, i.e., onmore » the recorded radiation spectrum. The results of model calculations of the calorimeter signal are compared with the experimental data.« less

X-Ray Dust Tomography: Mapping the Galaxy one X-ray Transient at a Time

NASA Astrophysics Data System (ADS)

Heinz, Sebastian; Corrales, Lia

2018-01-01

Tomography using X-ray light echoes from dust scattering by interstellar clouds is an accurate tool to study the line-of-sight distribution of dust. It can be used to measure distances to molecular clouds and X-ray sources, it can map Galactic structure in dust, and it can be used for precision measurements of dust composition and grain size distribution. Necessary conditions for observing echoes include a suitable X-ray lightcurve and sufficient dust column density to the source. I will discuss a tool set for studying dust echoes and show results obtained for some of the brightest echoes detected to date.

Measuring and interpreting X-ray fluorescence from planetary surfaces.

PubMed

Owens, Alan; Beckhoff, Burkhard; Fraser, George; Kolbe, Michael; Krumrey, Michael; Mantero, Alfonso; Mantler, Michael; Peacock, Anthony; Pia, Maria-Grazia; Pullan, Derek; Schneider, Uwe G; Ulm, Gerhard

2008-11-15

As part of a comprehensive study of X-ray emission from planetary surfaces and in particular the planet Mercury, we have measured fluorescent radiation from a number of planetary analog rock samples using monochromatized synchrotron radiation provided by the BESSY II electron storage ring. The experiments were carried out using a purpose built X-ray fluorescence (XRF) spectrometer chamber developed by the Physikalisch-Technische Bundesanstalt, Germany's national metrology institute. The XRF instrumentation is absolutely calibrated and allows for reference-free quantitation of rock sample composition, taking into account secondary photon- and electron-induced enhancement effects. The fluorescence data, in turn, have been used to validate a planetary fluorescence simulation tool based on the GEANT4 transport code. This simulation can be used as a mission analysis tool to predict the time-dependent orbital XRF spectral distributions from planetary surfaces throughout the mapping phase.

Deep Extragalactic X-Ray Surveys

NASA Astrophysics Data System (ADS)

Brandt, W. N.; Hasinger, G.

2005-09-01

Deep surveys of the cosmic X-ray background are reviewed in the context of observational progress enabled by the Chandra X-Ray Observatory and the X-Ray Multi-Mirror Mission-Newton. The sources found by deep surveys are described along with their redshift and luminosity distributions, and the effectiveness of such surveys at selecting active galactic nuclei (AGN) is assessed. Some key results from deep surveys are highlighted, including (a) measurements of AGN evolution and the growth of supermassive black holes, (b) constraints on the demography and physics of high-redshift AGN, (c) the X-ray AGN content of infrared and submillimeter galaxies, and (d) X-ray emission from distant starburst and normal galaxies. We also describe some outstanding problems and future prospects for deep extragalactic X-ray surveys.

New Solar Irradiance Measurements from the Miniature X-Ray Solar Spectrometer Cubesat

DOE Office of Scientific and Technical Information (OSTI.GOV)

Woods, Thomas N.; Jones, Andrew; Kohnert, Richard

The goal of the Miniature X-ray Solar Spectrometer ( MinXSS ) CubeSat is to explore the energy distribution of soft X-ray (SXR) emissions from the quiescent Sun, active regions, and during solar flares and to model the impact on Earth's ionosphere and thermosphere. The energy emitted in the SXR range (0.1–10 keV) can vary by more than a factor of 100, yet we have limited spectral measurements in the SXRs to accurately quantify the spectral dependence of this variability. The MinXSS primary science instrument is an Amptek, Inc. X123 X-ray spectrometer that has an energy range of 0.5–30 keV withmore » a nominal 0.15 keV energy resolution. Two flight models have been built. The first, MinXSS -1, has been making science observations since 2016 June 9 and has observed numerous flares, including more than 40 C-class and 7 M-class flares. These SXR spectral measurements have advantages over broadband SXR observations, such as providing the capability to derive multiple-temperature components and elemental abundances of coronal plasma, improved irradiance accuracy, and higher resolution spectral irradiance as input to planetary ionosphere simulations. MinXSS spectra obtained during the M5.0 flare on 2016 July 23 highlight these advantages and indicate how the elemental abundance appears to change from primarily coronal to more photospheric during the flare. MinXSS -1 observations are compared to the Geostationary Operational Environmental Satellite ( GOES ) X-ray Sensor (XRS) measurements of SXR irradiance and estimated corona temperature. Additionally, a suggested improvement to the calibration of the GOES XRS data is presented.« less

Methods for Reducing Singly Reflected Rays on the Wolter-I Focusing Figures of the FOXSI Rocket Experiment

NASA Technical Reports Server (NTRS)

Buitrago-Casas, Juan Camilo; Glesener, Lindsay; Christe, Steven; Elsner, Ronald; Ramsey, Brian; Courtade, Sasha; Ishikawa, Shin-nosuke; Narukage, Noriyuki; Vievering, Juliana; Subramania, Athiray;

Lightning x-rays inside thunderclouds, in-flight measurements on-board an A350

NASA Astrophysics Data System (ADS)

van Deursen, Alexander; Kochkin, Pavlo; de Boer, Alte; Bardet, Michiel; Boissin, Jean-François

2015-04-01

Thunderstorms emit bursts of energetic radiation. Moreover, lightning stepped leader produces x-ray pulses. The phenomena, their interrelation and impact on Earth's atmosphere and near space are not fully understood yet. The In-flight Lightning Strike Damage Assessment System ILDAS was developed in an EU FP6 project ( http://ildas.nlr.nl/ ) to provide information on threat that lightning poses to aircraft. It is intended to localize the lightning attachment points in order to reduce maintenance time and to build statics on lightning current. The system consists of 2 E-field sensors and a varying number of H-field sensors. It has recently been enhanced by two LaBr3 scintillation detectors inside the aircraft. The scintillation detectors are sensitive to x- and gamma-rays above 30 keV. The entire system is installed on-board of an A-350 aircraft and digitizes data with 100Msamples/sec rate when triggered by lightning. A continuously monitoring channel counts the number of occurrences that the x-ray signal exceeds a set of trigger levels. In the beginning of 2014 the aircraft flew through thunderstorm cells collecting the data from the sensors. The x-rays generated by the lightning flash are measured in synchronization better than 40 ns with the lightning current information during a period of 1 second around the strike. The continuous channel stores x-ray information with very limited time and amplitude resolution during the whole flight. That channel would allow x-rays from cosmic ray background, TGFs and continuous gamma-ray glow of thundercloud outside the 1 s time window. In the EGU2014 we presented the ILDAS system and showed that the x-ray detection works as intended. Fast x-ray bursts have been detected during stepped/dart stepped leaders and during interception of lightning. Data analysis of continuous channel recordings will be presented as well.

Spatially resolved density and ionization measurements of shocked foams using x-ray fluorescence

DOE Office of Scientific and Technical Information (OSTI.GOV)

MacDonald, M. J.; Keiter, P. A.; Montgomery, D. S.

2016-09-22

We present experiments at the Trident laser facility demonstrating the use of x-ray fluorescence (XRF) to simultaneously measure density, ionization state populations, and electron temperature in shocked foams. An imaging x-ray spectrometer was used to obtain spatially-resolved measurements of Ti K-more » $$\\alpha$$ emission. Density profiles were measured from K-$$\\alpha$$ intensity. Ti ionization state distributions and electron temperatures were inferred by fitting K-$$\\alpha$$ spectra to spectra from CRETIN simulations. This study shows that XRF provides a powerful tool to complement other diagnostics to make equation of state measurements of shocked materials containing a suitable tracer element.« less

VETA-1 x ray detection system

NASA Technical Reports Server (NTRS)

Podgorski, W. A.; Flanagan, Kathy A.; Freeman, Mark D.; Goddard, R. G.; Kellogg, Edwin M.; Norton, T. J.; Ouellette, J. P.; Roy, A. G.; Schwartz, Daniel A.

1992-01-01

The alignment and X-ray imaging performance of the Advanced X-ray Astrophysics Facility (AXAF) Verification Engineering Test Article-I (VETA-I) was measured by the VETA-I X-Ray Detection System (VXDS). The VXDS was based on the X-ray detection system utilized in the AXAF Technology Mirror Assembly (TMA) program, upgraded to meet the more stringent requirements of the VETA-I test program. The VXDS includes two types of X-ray detectors: (1) a High Resolution Imager (HRI) which provides X-ray imaging capabilities, and (2) sealed and flow proportional counters which, in conjunction with apertures of various types and precision translation stages, provide the most accurate measurement of VETA-I performance. Herein we give an overview of the VXDS hardware including X-ray detectors, translation stages, apertures, proportional counters and flow counter gas supply system and associated electronics. We also describe the installation of the VXDS into the Marshall Space Flight Center (MSFC) X-Ray Calibration Facility (XRCF). We discuss in detail the design and performance of those elements of the VXDS which have not been discussed elsewhere; translation systems, flow counter gas supply system, apertures and thermal monitoring system.

Surface studies of solids using integral X-ray-induced photoemission yield

PubMed Central

Stoupin, Stanislav; Zhernenkov, Mikhail; Shi, Bing

2016-01-01

X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permit extraction of thicknesses of individual layers. The approach does not require detection of the reflected radiation and can be considered as a framework for non-invasive evaluation of buried layers with hard X-rays under grazing incidence. PMID:27874041

Surface studies of solids using integral x-ray-induced photoemission yield

DOE PAGES

Stoupin, Stanislav; Zhernenkov, Mikhail; Shi, Bing

2016-11-22

X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permitmore » extraction of thicknesses of individual layers. The approach does not require detection of the reflected radiation and can be considered as a framework for non-invasive evaluation of buried layers with hard X-rays under grazing incidence.« less

X-ray based extensometry

NASA Technical Reports Server (NTRS)

Jordan, E. H.; Pease, D. M.

1988-01-01

A totally new method of extensometry using an X-ray beam was proposed. The intent of the method is to provide a non-contacting technique that is immune to problems associated with density variations in gaseous environments that plague optical methods. X-rays are virtually unrefractable even by solids. The new method utilizes X-ray induced X-ray fluorescence or X-ray induced optical fluorescence of targets that have melting temperatures of over 3000 F. Many different variations of the basic approaches are possible. In the year completed, preliminary experiments were completed which strongly suggest that the method is feasible. The X-ray induced optical fluorescence method appears to be limited to temperatures below roughly 1600 F because of the overwhelming thermal optical radiation. The X-ray induced X-ray fluorescence scheme appears feasible up to very high temperatures. In this system there will be an unknown tradeoff between frequency response, cost, and accuracy. The exact tradeoff can only be estimated. It appears that for thermomechanical tests with cycle times on the order of minutes a very reasonable system may be feasible. The intended applications involve very high temperatures in both materials testing and monitoring component testing. Gas turbine engines, rocket engines, and hypersonic vehicles (NASP) all involve measurement needs that could partially be met by the proposed technology.

HERCULES X-1: USING ECLIPSE TO MEASURE THE X-RAY CORONA

DOE Office of Scientific and Technical Information (OSTI.GOV)

Leahy, D. A.

Observations of HZ Her/Her X-1 by the Rossi X-ray Timing Explorer during High State X-ray eclipses are analyzed. After a sharp ingress caused by the neutron star receding behind the companion star HZ Her, X-ray flux smoothly declines to a minimum at mid-eclipse. It then increases smoothly until egress. The mid-eclipse flux implies an extended emission region around the neutron star that is larger than that of HZ Her. The constancy of the X-ray softness ratio is consistent with electron scattering by an ionized corona. The corona is modeled as spherically symmetric with a power-law density profile. We find amore » best fit of ∝r {sup –1.25} with a normalization of ≅ 10{sup 12} cm{sup –3} at r = 2 × 10{sup 10} cm. The corona could either be in hydrostatic equilibrium, with heating by Compton scattering, a fast outflow, with a high mass-loss rate of ∼10{sup 18} gm s{sup –1}, or a hybrid, with an inner hydrostatic region and outer slow flow with a low mass-loss rate. A brightening at orbital phase 0.94 is suggested to be caused by the impact of the accretion stream with the accretion disk.« less

Generation of High Brightness X-rays with the PLEIADES Thomson X-ray Source

DOE Office of Scientific and Technical Information (OSTI.GOV)

Brown, W J; Anderson, S G; Barty, C P J

2003-05-28

The use of short laser pulses to generate high peak intensity, ultra-short x-ray pulses enables exciting new experimental capabilities, such as femtosecond pump-probe experiments used to temporally resolve material structural dynamics on atomic time scales. PLEIADES (Picosecond Laser Electron InterAction for Dynamic Evaluation of Structures) is a next generation Thomson scattering x-ray source being developed at Lawrence Livermore National Laboratory (LLNL). Ultra-fast picosecond x-rays (10-200 keV) are generated by colliding an energetic electron beam (20-100 MeV) with a high intensity, sub-ps, 800 nm laser pulse. The peak brightness of the source is expected to exceed 10{sup 20} photons/s/0.1% bandwidth/mm2/mrad2. Simulationsmore » of the electron beam production, transport, and final focus are presented. Electron beam measurements, including emittance and final focus spot size are also presented and compared to simulation results. Measurements of x-ray production are also reported and compared to theoretical calculations.« less

On the evaluation of the absolute photon energy of Cu Kα, β lines using 4-crystal X -ray spectrometer

NASA Astrophysics Data System (ADS)

Ito, Yoshiaki; Tochio, Tatsunori; Fukushima, Sei

A 4-crystal X-ray spectrometer was designed based on a 2-crystal X-ray spectrometer to be able to perform the absolute measurement of Bragg angle. This basic thought based on 2 crystals dates back to the times to A.Compton etc.. Because a distortion to give the crystal by the adhesive when a crystal was glued, greatly affected the X-rays profile, we changed it to the channel cut crystal without a free distortion as for having made each crystal of 2-crystal a channel cut. The influence of the foot in the spectral profile is more suppressed because four times of reflections reflect it. It is a high resolution so as not to need to consider instrumental function by the reflection degree that a specific atomic analysis can be executed with the chemical state which it is possible for making the placement of the 4-crystal (+, +) setting. This type of spectrum device is first time in the world. Because the absolute measurement of 2 θ angles is enabled by (+,-) and (+, +) setting from the center of gravity position of the rocking curve and the center of gravity position of the X-rays spectrum, we may measure the absolute value of the X-ray photon energy. Because we evaluated the energy of the Cu Kα , β lines, we report it. We acknowledge financial support for the measurements of a part of the data by the REXDAB collaboration that was initiated within the International Fundamental Parameter Initiative.

A convenient method for X-ray analysis in TEM that measures mass thickness and composition

NASA Astrophysics Data System (ADS)

Statham, P.; Sagar, J.; Holland, J.; Pinard, P.; Lozano-Perez, S.

2018-01-01

We consider a new approach for quantitative analysis in transmission electron microscopy (TEM) that offers the same convenience as single-standard quantitative analysis in scanning electron microscopy (SEM). Instead of a bulk standard, a thin film with known mass thickness is used as a reference. The procedure involves recording an X-ray spectrum from the reference film for each session of acquisitions on real specimens. There is no need to measure the beam current; the current only needs to be stable for the duration of the session. A new reference standard with a large (1 mm x 1 mm) area of uniform thickness of 100 nm silicon nitride is used to reveal regions of X-ray detector occlusion that would give misleading results for any X-ray method that measures thickness. Unlike previous methods, the new X-ray method does not require an accurate beam current monitor but delivers equivalent accuracy in mass thickness measurement. Quantitative compositional results are also automatically corrected for specimen self-absorption. The new method is tested using a wedge specimen of Inconel 600 that is used to calibrate the high angle angular dark field (HAADF) signal to provide a thickness reference and results are compared with electron energy-loss spectrometry (EELS) measurements. For the new X-ray method, element composition results are consistent with the expected composition for the alloy and the mass thickness measurement is shown to provide an accurate alternative to EELS for thickness determination in TEM without the uncertainty associated with mean free path estimates.

Measuring x-ray spectra of flash radiographic sources [PowerPoint

DOE Office of Scientific and Technical Information (OSTI.GOV)

Gehring, Amanda Elizabeth; Espy, Michelle A.; Haines, Todd Joseph

2015-11-02

The x-ray spectra of flash radiographic sources are difficult to measure. The sources measured were Radiographic Integrated Test Stand-6 (370 rad at 1 m; 50 ns pulse) and Dual Axis Radiographic Hydrodynamic Test Facility (DARHT) (550 rad at 1 m; 50 ns pulse). Features of the Compton spectrometer are described, and spectra are shown. Additional slides present data on instrumental calibration.

Eta Carinae's Thermal X-Ray Tail Measured with XMM-Newton and NuStar

NASA Technical Reports Server (NTRS)

Hamaguchi, Kenji; Corcoran, Michael F.; Gull, Theodore R.; Takahashi, Hiromitsu; Grefenstette, Brian; Yuasa, Takayuki; Stuhlinger, Martin; Russell, Christopher; Moffat, Anthony F. J.; Madura, Thomas

2016-01-01

The evolved, massive highly eccentric binary system, Car, underwent a periastron passage in the summer of 2014. We obtained two coordinated X-ray observations with XMM-Newton and NuSTAR during the elevated X-ray flux state and just before the X-ray minimum flux state around this passage. These NuSTAR observations clearly detected X-ray emission associated with eta Car extending up to approx. 50 keV for the first time. The NuSTAR spectrum above 10 keV can be fit with the bremsstrahlung tail from a kT approx. 6 keV plasma. This temperature is delta kT 2 keV higher than those measured from the iron K emission line complex, if the shocked gas is in collisional ionization equilibrium. This result may suggest that the companion star's pre-shock wind velocity is underestimated. The NuSTAR observation near the X-ray minimum state showed a gradual decline in the X-ray emission by 40% at energies above 5 keV in a day, the largest rate of change of the X-ray flux yet observed in individual eta Car observations. The column density to the hardest emission component, N(sub H) approx. 10(exp24) H cm(exp-2), marked one of the highest values ever observed for eta Car, strongly suggesting the increased obscuration of the wind-wind colliding X-ray emission by the thick primary stellar wind prior to superior conjunction. Neither observation detected the power-law component in the extremely hard band that INTEGRAL and Suzaku observed prior to 2011. The power-law source might have faded before these observations.

Direct measurement of mammographic X-ray spectra with a digital CdTe detection system.

PubMed

Abbene, Leonardo; Gerardi, Gaetano; Principato, Fabio; Del Sordo, Stefano; Raso, Giuseppe

2012-01-01

In this work we present a detection system, based on a CdTe detector and an innovative digital pulse processing (DPP) system, for high-rate X-ray spectroscopy in mammography (1-30 keV). The DPP system performs a height and shape analysis of the detector pulses, sampled and digitized by a 14-bit, 100 MHz ADC. We show the results of the characterization of the detection system both at low and high photon counting rates by using monoenergetic X-ray sources and a nonclinical X-ray tube. The detection system exhibits excellent performance up to 830 kcps with an energy resolution of 4.5% FWHM at 22.1 keV. Direct measurements of clinical molybdenum X-ray spectra were carried out by using a pinhole collimator and a custom alignment device. A comparison with the attenuation curves and the half value layer values, obtained from the measured and simulated spectra, from an ionization chamber and from a solid state dosimeter, also shows the accuracy of the measurements. These results make the proposed detection system a very attractive tool for both laboratory research, calibration of dosimeters and advanced quality controls in mammography.

Ionized absorbers, ionized emitters, and the X-ray spectrum of active galactic nuclei

NASA Technical Reports Server (NTRS)

Netzer, Hagai

1993-01-01

Broad absorption features are common in the X-ray spectrum of low-luminosity AGNs. The features have been modeled by leaky neutral absorbers or by highly ionized gas that completely occult the continuum source. Such models are incomplete since they do not take into account all the physical processes in the gas. In particular, no previous model included the X-ray emission by the ionized absorbing gas and the reflection of the continuum source radiation. The present work discusses the emission, absorption, and reflection properties of photoionized gases with emphasis on conditions thought to prevail in AGNs. It shows that such gas is likely to produce intense X-ray line and continuum radiation and to reflect a sizable fraction of the nonstellar continuum at all energies. If such gas is indeed responsible for the observed X-ray absorption, then absorption edges are much weaker than commonly assumed, and some residual X-ray continuum is likely to be observed even if the line of sight is completely blocked. Moreover, X-ray emission features may show up in sources not showing X-ray absorption. This has immense consequences for medium-resolution X-ray missions, such as BBXRT and Astro-D, and for the planned high-resolution experiments on board XMM and AXAF.

Dante Soft X-ray Power Diagnostic for NIF

DOE Office of Scientific and Technical Information (OSTI.GOV)

Dewald, E; Campbell, K; Turner, R

2004-04-15

Soft x-ray power diagnostics are essential for measuring spectrally resolved the total x-ray flux, radiation temperature, conversion efficiency and albedo that are important quantities for the energetics of indirect drive hohlraums. At the Nova or Omega Laser Facilities, these measurements are performed mainly with Dante, but also with DMX and photo-conductive detectors (PCD's). The Dante broadband spectrometer is a collection of absolute calibrated vacuum x-ray diodes, thin filters and x-ray mirrors used to measure the soft x-ray emission for photon energies above 50 eV.

[Characteristics of specifications of transportable inverter-type X-ray equipment].

PubMed

Yamamoto, Keiichi; Miyazaki, Shigeru; Asano, Hiroshi; Shinohara, Fuminori; Ishikawa, Mitsuo; Ide, Toshinori; Abe, Shinji; Negishi, Toru; Miyake, Hiroyuki; Imai, Yoshio; Okuaki, Tomoyuki

2003-07-01

Our X-ray systems study group measured and examined the characteristics of four transportable inverter-type X-ray equipments. X-ray tube voltage and X-ray tube current were measured with the X-ray tube voltage and the X-ray tube current measurement terminals provided with the equipment. X-ray tube voltage, irradiation time, and dose were measured with a non-invasive X-ray tube voltage-measuring device, and X-ray output was measured by fluorescence meter. The items investigated were the reproducibility and linearity of X-ray output, error of pre-set X-ray tube voltage and X-ray tube current, and X-ray tube voltage ripple percentage. The waveforms of X-ray tube voltage, the X-ray tube current, and fluorescence intensity draw were analyzed using the oscilloscope gram and a personal computer. All of the equipment had a preset error of X-ray tube voltage and X-ray tube current that met JIS standards. The X-ray tube voltage ripple percentage of each equipment conformed to the tendency to decrease when X-ray tube voltage increased. Although the X-ray output reproducibility of system A exceeded the JIS standard, the other systems were within the JIS standard. Equipment A required 40 ms for X-ray tube current to reach the target value, and there was some X-ray output loss because of a trough in X-ray tube current. Owing to the influence of the ripple in X-ray tube current, the strength of the fluorescence waveform rippled in equipments B and C. Waveform analysis could not be done by aliasing of the recording device in equipment D. The maximum X-ray tube current of transportable inverter-type X-ray equipment is as low as 10-20 mA, and the irradiation time of chest X-ray photography exceeds 0.1 sec. However, improvement of the radiophotographic technique is required for patients who cannot move their bodies or halt respiration. It is necessary to make the irradiation time of the equipments shorter for remote medical treatment.

Accurate macromolecular structures using minimal measurements from X-ray free-electron lasers

PubMed Central

Hattne, Johan; Echols, Nathaniel; Tran, Rosalie; Kern, Jan; Gildea, Richard J.; Brewster, Aaron S.; Alonso-Mori, Roberto; Glöckner, Carina; Hellmich, Julia; Laksmono, Hartawan; Sierra, Raymond G.; Lassalle-Kaiser, Benedikt; Lampe, Alyssa; Han, Guangye; Gul, Sheraz; DiFiore, Dörte; Milathianaki, Despina; Fry, Alan R.; Miahnahri, Alan; White, William E.; Schafer, Donald W.; Seibert, M. Marvin; Koglin, Jason E.; Sokaras, Dimosthenis; Weng, Tsu-Chien; Sellberg, Jonas; Latimer, Matthew J.; Glatzel, Pieter; Zwart, Petrus H.; Grosse-Kunstleve, Ralf W.; Bogan, Michael J.; Messerschmidt, Marc; Williams, Garth J.; Boutet, Sébastien; Messinger, Johannes; Zouni, Athina; Yano, Junko; Bergmann, Uwe; Yachandra, Vittal K.; Adams, Paul D.; Sauter, Nicholas K.

2014-01-01

X-ray free-electron laser (XFEL) sources enable the use of crystallography to solve three-dimensional macromolecular structures under native conditions and free from radiation damage. Results to date, however, have been limited by the challenge of deriving accurate Bragg intensities from a heterogeneous population of microcrystals, while at the same time modeling the X-ray spectrum and detector geometry. Here we present a computational approach designed to extract statistically significant high-resolution signals from fewer diffraction measurements. PMID:24633409

High-Mass X-ray Binaries in hard X- rays

NASA Astrophysics Data System (ADS)

Lutovinov, Alexander

We present a review of the latest results of the all-sky survey, performed with the INTEGRAL observatory. The deep exposure spent by INTEGRAL in the Galactic plane region, as well as for nearby galaxies allowed us to obtain a flux limited sample for High Mass X-ray Binaries in the Local Galactic Group and measure their physical properties, like a luminosity function, spatial density distribution, etc. Particularly, it was determined the most accurate up to date spatial density distribution of HMXBs in the Galaxy and its correlation with the star formation rate distribution. Based on the measured value of the vertical distribution of HMXBs (a scale-height h~85 pc) we also estimated a kinematical age of HMXBs. Properties of the population of HMXBs are explained in the framework of the population synthesis model. Based on this model we argue that a flaring activity of so-called supergiant fast X-ray transients (SFXTs), the recently recognized sub-sample of HMXBs, is likely related with the magnetic arrest of their accretion. The resulted global characteristics of the HMXB population are used for predictions of sources number counts in sky surveys of future X-ray missions.

Depth profiling of marker layers using x-ray waveguide structures

NASA Astrophysics Data System (ADS)

Gupta, Ajay; Rajput, Parasmani; Saraiya, Amit; Reddy, V. R.; Gupta, Mukul; Bernstorff, Sigrid; Amenitsch, H.

2005-08-01

It is demonstrated that x-ray waveguide structures can be used for depth profiling of a marker layer inside the guiding layer with an accuracy of better than 0.2 nm. A combination of x-ray fluorescence and x-ray reflectivity measurements can provide detailed information about the structure of the guiding layer. The position and thickness of the marker layer affect different aspects of the angle-dependent x-ray fluorescence pattern, thus making it possible to determine the structure of the marker layer in an unambiguous manner. As an example, effects of swift heavy ion irradiation on a Si/M/Si trilayer ( M=Fe , W), forming the cavity of the waveguide structure, have been studied. It is found that in accordance with the prediction of thermal spike model, Fe is much more sensitive to swift heavy ion induced modifications as compared to W, even in thin film form. However, a clear evidence of movement of the Fe marker layer towards the surface is observed after irradiation, which cannot be understood in terms of the thermal spike model alone.